@Preamble{
"\input path.sty "
#
"\hyphenation{
Holtz-berg
Leh-mann
Paz-i-en-za
Por-i-nel-li
Schles-ing-er
Scheu-ing
Sgua-zze-ro
Yosh-i-mi-ne
}"
#
"\ifx \undefined \TM \def \TM {${}^{\sc TM}$} \fi"
}
@String{ack-nhfb = "Nelson H. F. Beebe,
University of Utah,
Department of Mathematics, 110 LCB,
155 S 1400 E RM 233,
Salt Lake City, UT 84112-0090, USA,
Tel: +1 801 581 5254,
e-mail: \path|beebe@math.utah.edu|,
\path|beebe@acm.org|,
\path|beebe@computer.org| (Internet),
URL: \path|https://www.math.utah.edu/~beebe/|"}
@String{ack-nj = "Norbert Juffa,
2445 Mission College Blvd.,
Santa Clara, CA 95054,
USA,
e-mail: \path|norbert@@iit.com|"}
@String{j-COMP-J = "The Computer Journal"}
@String{j-IBM-JRD = "IBM Journal of Research and Development"}
@String{j-J-MATH-PHYS = "Journal of Mathematical Physics"}
@String{j-SIGPLAN = "ACM SIGPLAN Notices"}
@String{pub-IBM = "IBM Corporation"}
@String{pub-IBM:adr = "Armonk, NY, USA"}
@String{pub-MCGRAW-HILL = "Mc{\-}Graw-Hill"}
@String{pub-MCGRAW-HILL:adr = "New York, NY, USA"}
@String{pub-SV = "Spring{\-}er-Ver{\-}lag"}
@String{pub-SV:adr = "Berlin, Germany~/ Heidelberg,
Germany~/ London, UK~/ etc."}
@Article{Anonymous:1957:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "1--1",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1957.5392710",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392710",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cameron:1957:DOB,
author = "D. P. Cameron",
title = "Domain Orientation in Barium Titanate Single
Crystals",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "2--7",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392711",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greanias:1957:DLR,
author = "E. C. Greanias and C. J. Hoppel and M. Kloomok and J.
S. Osborne",
title = "Design of Logic for Recognition of Printed Characters
by Simulation",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "8--18",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0008",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392712",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Redfield:1957:TRP,
author = "A. G. Redfield",
title = "On the Theory of Relaxation Processes",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "19--31",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0019",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392713",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wyma:1957:TDP,
author = "E. R. Wyma",
title = "A Three-Dimensional Printed Back Panel",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "32--38",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0032",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392714",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swanson:1957:CFO,
author = "J. A. Swanson",
title = "Clarification of First-Order Semiconduction Effects
through Use of Electrochemical Potentials",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "39--43",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0039",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392715",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ittner:1957:SCR,
author = "W. B. {Ittner III} and P. J. Magill",
title = "A Survey of Contact Resistance Theory for Nominally
Clean Surfaces",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "44--48",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0044",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392716",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fitch:1957:DEC,
author = "C. J. Fitch",
title = "Development of the Electrostatic Clutch",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "49--56",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0049",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392717",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zaromb:1957:ADS,
author = "S. Zaromb",
title = "An Analysis of Diffusion in Semiconductors",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "57--61",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0057",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392718",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lesser:1957:RAM,
author = "M. L. Lesser and J. W. Haanstra",
title = "The Random-Access Memory Accounting Machine --- {I}.
System Organization of the {IBM 305}",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "62--71",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0062",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392719",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxauthor = "S. Zaromb",
}
@Article{Noyes:1957:RAM,
author = "T. Noyes and W. E. Dickinson",
title = "The Random-Access Memory Accounting Machine --- {II}.
{The} Magnetic-Disk, Random-Access Memory",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "72--75",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0072",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392720",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Astrahan:1957:LDD,
author = "M. M. Astrahan and B. Housman and J. F. Jacobs and R.
P. Mayer and W. H. Thomas",
title = "Logical design of the digital computer for the {SAGE
System}",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "76--83",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0076",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "18,678c",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392721;
http://www.research.ibm.com/journal/rd/011/ibmrd0101L.pdf",
abstract = "Special design features and performance criteria are
described for the logical system in the digital
computer used in the SAGE (Semi-Automatic Ground
Environment) air defense system. Design details are
given for the arithmetic element, high-speed multiply,
index registers, input-output control, and magnetic
drum buffer. The system is designed according to
special military application requirements of speed,
capacity, reliability and flexibility. R",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "John W. Carr III",
}
@Article{Gunther-Mohr:1957:SCT,
author = "G. R. Gunther-Mohr and S. Triebwasser",
title = "Simple Constant-Temperature Oven and Control System",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "84--89",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0084",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392722",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gunther-Moore:1957:SCT,
author = "G. R. Gunther-Moore and S. Triebwasser",
title = "Simple Constant-Temperature Oven and Control System",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "84--??",
month = jan,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cole:1957:LPZ,
author = "H. Cole and F. Chambers and H. Dunn",
title = "Lattice Parameters of {Zn$_3$As$_2$}",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "90--92",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0090",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392723",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Horton:1957:GTM,
author = "J. W. Horton",
title = "A General Theory of Multiple Spin Echoes",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "93--95",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0093",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392724",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "96--97",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0096",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392725",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RPIa,
author = "Anonymous",
title = "Recent Papers by {IBM} Authors",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "96--??",
month = jan,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "98--98",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0098",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392726",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Aa,
author = "Anonymous",
title = "The Authors",
journal = j-IBM-JRD,
volume = "1",
number = "1",
pages = "99--100",
month = jan,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.11.0099",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:30 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392727",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "101--101",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1957.5392729",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392729",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Foss:1957:WMC,
author = "E. Foss and R. S. Partridge",
title = "A 32,000-Word Magnetic-Core Memory",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "102--109",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0102",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Contains photographs of vacuum-tube memory control
system, and a large core panel containing 1KB of
memory.",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392730",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kogbetliantz:1957:CUE,
author = "E. G. Kogbetliantz",
title = "Computation of $e^{N}$ for $-\infty < {N} < +\infty$
Using an Electronic Computer",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "110--115",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0110",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,775d",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392731",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. F. Freiberger",
}
@Article{Dunham:1957:MBD,
author = "B. Dunham",
title = "The Multipurpose Bias Device --- {Part I}: The
Commutator Transistor",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "116--129",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0116",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392732",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Peterson:1957:ARA,
author = "W. W. Peterson",
title = "Addressing for Random-Access Storage",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "130--146",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,69d",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/hash.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "First major paper dealing with the problem of
searching in large files. Defined open addressing in
general, analyzed the performance of uniform hashing,
and the behavior of linear open addressing with various
bucket sizes.",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392733",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
country = "USA",
date = "00/00/00",
descriptor = "Hash coding",
enum = "2417",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
location = "PKI-OG: Li-Ord.Le",
references = "0",
revision = "21/04/91",
town = "Yorktown Heights",
}
@Article{Price:1957:LN,
author = "P. J. Price",
title = "The {Lorenz} Number",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "147--157",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0147",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "82.0X",
MRnumber = "19,792e",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392734",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P.-O. L{\"o}wdin",
}
@Article{Murphy:1957:PIA,
author = "R. W. Murphy",
title = "A Positive-Integer Arithmetic for Data Processing",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "158--170",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0158",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "18,939d",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392735;
http://www.research.ibm.com/journal/rd/012/ibmrd0102G.pdf",
abstract = "It is hypothesized that positive numbers suffice for
the expression of quantities in accounting. New
arithmetic operations are devised that yield
non-negative results in computation, and the
applicability of these operations to data processing is
studied. These operations permit a wide variety of
functions to be computed with fewer and less complex
steps and imply the feasibility of constructing less
complex data-processing machines.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "C. C. Gotlieb",
}
@Article{Ghazala:1957:IDC,
author = "M. J. Ghazala (Gazale)",
title = "Irredundant Disjunctive and Conjunctive Forms of a
{Boolean} Function",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "171--176",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0171",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392736",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schatzoff:1957:MMD,
author = "M. Schatzoff and W. B. Harding",
title = "A Mathematical Model for Determining the Probabilities
of Undetected Errors in Magnetic Tape Systems",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "177--180",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0177",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392737",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schatzhoff:1957:MMD,
author = "M. Schatzhoff and W. B. Harding",
title = "A Mathematical Model for Determining the Probabilities
of Undetected Errors in Magnetic Tape Systems",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "177--??",
month = apr,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seader:1957:SCS,
author = "L. D. Seader",
title = "A Self-Clocking System for Information Transfer",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "181--184",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0181",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392738",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Walsh:1957:STS,
author = "J. L. Walsh",
title = "A Symmetrical-Transistor Steering Circuit",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "185--188",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0185",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392739",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{vonHorn:1957:DTR,
author = "H. B. {von Horn} and W. Y. Stevens",
title = "Determination of Transient Response of a Drift
Transistor Using the Diffusion Equation",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "189--191",
month = apr,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0189",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392740",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "192--193",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0192",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392741",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ab,
author = "Anonymous",
title = "Abstracts",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "192--??",
month = apr,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "194--194",
month = apr,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "194--194",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0194",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392742",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "195--196",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.12.0195",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392743",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ad,
author = "Anonymous",
title = "The Authors",
journal = j-IBM-JRD,
volume = "1",
number = "2",
pages = "195--??",
month = apr,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "197--197",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1957.5392680",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392680",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greenblott:1957:DPM,
author = "B. J. Greenblott and J. E. Wallace",
title = "Development of the Permissive-Make Relay",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "198--211",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0198",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392681",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greenblatt:1957:DPM,
author = "B. J. Greenblatt and J. E. Wallace",
title = "Development of the Permissive-Make Relay",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "198--??",
month = jul,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rutz:1957:TCT,
author = "R. F. Rutz",
title = "Two-Collector Transistor for Binary Full Addition",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "212--222",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0212",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392682",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Landauer:1957:SVC,
author = "R. Landauer",
title = "Spatial variation of currents and fields due to
localized scatterers in metallic conduction",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "223--231",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0223",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "78.0X",
MRnumber = "19,805g",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392683",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P.-O. L{\"o}wdin",
}
@Article{Smith:1957:MAM,
author = "W. V. Smith",
title = "Microwave Amplification by {MASER} Techniques",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "232--238",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0232",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392684",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1957:LHE,
author = "P. J. Price",
title = "The Linear {Hall} Effect",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "239--248",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0239",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "82.2X",
MRnumber = "19,591g",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392685",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P. W. Anderson",
}
@Article{Tasman:1957:LDP,
author = "P. Tasman",
title = "Literary Data Processing",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "249--256",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0249",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,584a",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392686",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. F. Freiberger",
}
@Article{Walker:1957:EMA,
author = "R. M. Walker and D. E. Rosenheim and P. A. Lewis and
A. G. Anderson",
title = "An Experimental 50-Megacycle Arithmetic Unit",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "257--278",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0257",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392687;
http://www.research.ibm.com/journal/rd/013/ibmrd0103H.pdf",
abstract = "An experimental 50-megacycle arithmetic unit has been
built which performs a repetitive multiplication
program and checks the results for errors. The unit
uses pulse circuitry which has been developed to
perform digital operations at a 50-megacycle
pulse-repetition rate. This paper describes the
arithmetic system and the circuits which perform the
required functions. These circuits include a full
binary adder, a phase-locked frequency divider which
provides a 3.125-megacycle secondary timing source, a
reshaping and retiming circuit using germanium diodes
and capacitive storage, a high-speed shift register, a
high-speed indicator register, and a binary word
generator.\par
Various novel features of a digital system operating at
these high speeds are described. These include the use
of coaxial delay lines for the distribution of signals
and as storage elements, and the use of secondary
emission tubes in amplifier and multivibrator
circuits.\par
In a 50-megacycle system the interdependence of the
space and time dimensions is marked, and although this
introduces problems which are not ordinarily
encountered in computing systems, it may be used
advantageously to provide features such as the
variable-phase clock system used in the arithmetic
unit.\par
The performance and reliability of the arithmetic unit
are discussed as well as the reliability of the
components and circuits which make up the system.
Although the techniques and circuitry discussed here
have been applied only to a relatively simple
arithmetic unit, it is felt that they could be useful
in a variety of high-speed computing and measurements
applications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hanson:1957:MMT,
author = "J. S. Hanson",
title = "Microsectioning: a Metallographic Technique for
Semiconductor Devices",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "279--288",
month = jul,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0279",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392688",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "289--290",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0289",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392689",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ae,
author = "Anonymous",
title = "Abstracts",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "289--??",
month = jul,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "291--291",
month = jul,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "291--291",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0291",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392690",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Af,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "292--292",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.13.0292",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392691",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ag,
author = "Anonymous",
title = "The Authors",
journal = j-IBM-JRD,
volume = "1",
number = "3",
pages = "292--??",
month = jul,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:TCd,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "293--293",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1957.5392693",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392693",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Young:1957:P,
author = "D. R. Young",
title = "Preface",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "293--293",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0293",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392694",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Crowe:1957:TFS,
author = "J. W. Crowe",
title = "Trapped-Flux Superconducting Memory",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "294--303",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0294",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392695",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Garwin:1957:AOP,
author = "R. L. Garwin",
title = "An Analysis of the Operation of a
Persistent-Supercurrent Memory Cell",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "304--308",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0304",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392696",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Luhn:1957:SAM,
author = "Hans Peter Luhn",
title = "A statistical approach to mechanized encoding and
searching of literary information",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "309--317",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0309",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.0X",
MRnumber = "19,1028c",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392697",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "M. L. Minsky",
}
@Article{Drougard:1957:EEF,
author = "M. E. Drougard and E. J. Huibregtse",
title = "The Effect of an Electric Field on the Transitions of
Barium Titanate",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "318--329",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0318",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392698",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Taylor:1957:MHL,
author = "R. Taylor",
title = "A Mechanical Heart-Lung Apparatus",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "330--340",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0330",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392699",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dunham:1957:FSL,
author = "B. Dunham",
title = "The formalization of scientific languages. {I}. {The}
work of {Woodger} and {Hull}",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "341--348",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0341",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "92.0X",
MRnumber = "19,1147j",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392700;
http://www.research.ibm.com/journal/rd/014/ibmrd0104G.pdf",
abstract = "The extent to which scientific languages can be
formalized is an important problem, especially if it is
assumed that a theorem-proving machine will deal most
effectively with formal systems. In Part I, the
axiomatic attempts of Woodger in genetics and of Hull
in the theory of rote learning are examined. In Parts
II and III, to be published later, the more prominent
efforts to formalize physical theory will be considered
and a general study will be made of related
questions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Gorn",
}
@Article{Nicollian:1957:REH,
author = "E. H. Nicollian and G. R. Gunther-Mohr and L. R.
Weisberg",
title = "A Radiant-Energy Heater Using an Ellipsoidal
Reflector",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "349--355",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0349",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392701",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smura:1957:BWC,
author = "E. J. Smura",
title = "A Binary-Weighted Current Decoder",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "356--362",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0356",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392702",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sarley:1957:RIC,
author = "J. M. Sarley and R. J. Hendry",
title = "Radio-Interference Control as Applied to Business
Machines",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "363--372",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0363",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392703",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxauthor = "J. M. Sarley and R. J. Hendery",
}
@Article{Kurtz:1957:SCF,
author = "J. A. Kurtz",
title = "Superconducting Connections to Films",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "373--373",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0373",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392704",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "374-",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0374",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392705",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RPI,
author = "Anonymous",
title = "Recent Papers by {IBM} Authors",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "374--??",
month = oct,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "378--378",
month = oct,
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0378",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392706",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ah,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "379--380",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.14.0379",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392707",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:Ai,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "379--??",
month = oct,
year = "1957",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 09:02:59 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1957:CPI,
author = "Anonymous",
title = "Contents of Previous Issues",
journal = j-IBM-JRD,
volume = "1",
number = "4",
pages = "380--380",
month = "????",
year = "1957",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1957.5392708",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392708",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "1--1",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392653",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392653",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Friedberg:1958:LMI,
author = "R. M. Friedberg",
title = "A learning machine: {I}",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "2--13",
month = jan,
year = "1958",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,1085c",
bibdate = "Mon Feb 12 08:25:35 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "M. L. Minsky",
}
@Article{Friedberg:1958:LMP,
author = "R. M. Friedberg",
title = "A Learning Machine: {Part I}",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "2--13",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392654",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Knapp:1958:ESS,
author = "C. H. Knapp and E. Shapiro and R. A. Thorpe",
title = "An Error-Sampled Sweep-Position Control System",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "14--35",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0014",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392655",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seader:1958:MRH,
author = "L. D. Seader",
title = "Magnetic-Recording-Head Selection Switch",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "36--42",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0036",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392656",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kogbetliantz:1958:CAUa,
author = "E. G. Kogbetliantz",
title = "Computation of Arctan {N} for $-\infty < {N} <
+\infty$ Using an Electronic Computer",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "43--53",
month = jan,
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0043",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.3X",
MRnumber = "19,982e",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392657",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "C. B. Haselgrove",
}
@Article{Credle:1958:ELT,
author = "A. B. Credle",
title = "Effects of Low Temperatures on Transistor
Characteristics",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "54--71",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0054",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392658",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lentz:1958:NAS,
author = "J. J. Lentz",
title = "A New Approach to Small-Computer Programming and
Control",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "72--83",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0072",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392659",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "84--85",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0084",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392660",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "86--86",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0086",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392661",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "87--87",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.21.0087",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392662",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:CPI,
author = "Anonymous",
title = "Contents of Previous Issues",
journal = j-IBM-JRD,
volume = "2",
number = "1",
pages = "88--88",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392663",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392663",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "89--89",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392665",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392665",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hoagland:1958:HRM,
author = "A. S. Hoagland",
title = "High-Resolution Magnetic Recording Structures",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "90--104",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0090",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392666",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jeenel:1958:PTR,
author = "J. Jeenel",
title = "Programs as a tool for research in systems
organization",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "105--122",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0105",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,1085d",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392667",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Gorn",
}
@Article{Price:1958:SMI,
author = "P. J. Price",
title = "On the Statistical Mechanics of Impurity Conduction in
Semiconductors",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "123--129",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0123",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392668",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Skov:1958:PTD,
author = "R. A. Skov",
title = "Pulse Time Displacement in High-Density Magnetic
Tape",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "130--141",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392669",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dickinson:1958:RIU,
author = "W. E. Dickinson and R. M. Walker",
title = "Reliability Improvement by the Use of Multiple-Element
Switching Circuits",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "142--147",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0142",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392670",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Flehinger:1958:RIT,
author = "B. J. Flehinger",
title = "Reliability Improvement through Redundancy at Various
System Levels",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "148--158",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0148",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392671",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Luhn:1958:ACL,
author = "Hans Peter Luhn",
title = "The Automatic Creation of Literature Abstracts",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "159--165",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0159",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.0X",
MRnumber = "19,888e",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392672",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic abstract generation",
reviewer = "C. C. Gotlieb",
}
@Article{Peterson:1958:CA,
author = "W. W. Peterson",
title = "On Checking an Adder",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "166--168",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0166",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392673",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:1958:NCE,
author = "T. C. Chen and R. A. Willoughby",
title = "A note on the computation of eigenvalues and vectors
of {Hermitean} matrices",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "169--170",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0169",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.00",
MRnumber = "20 \#2837",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392674",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P. Henrici",
}
@Article{Anonymous:1958:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "171--172",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0171",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392675",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "173--173",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0173",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392676",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "174--175",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.22.0174",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392677",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:CPFa,
author = "Anonymous",
title = "Contents of Previous Four Issues",
journal = j-IBM-JRD,
volume = "2",
number = "2",
pages = "276--276",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392678",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392678",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "177--177",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392619",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392619",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Walton:1958:DRP,
author = "C. A. Walton",
title = "A Direct-Reading Printed-Circuit Commutator for
Analog-to-Digital Data Conversion",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "178--192",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0178",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392620",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shafer:1958:PEF,
author = "M. W. Shafer",
title = "Phase Equilibria in the Ferrite Region of the System
Manganese-Iron-Oxygen",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "193--199",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0193",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392621",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1958:PIM,
author = "P. J. Price",
title = "The Physical Interpretation of Mean Free Path and the
Integral Method",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "200--203",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0200",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392622",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Constantine:1958:LSM,
author = "G. Constantine",
title = "A Load-Sharing Matrix Switch",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "204--211",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0204",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392623",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Triebwasser:1958:SSO,
author = "S. Triebwasser",
title = "Study of the Second-Order Ferroelectric Transition in
Tri-Glycine Sulfate",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "212--217",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0212",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392624",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kogbetliantz:1958:CAUb,
author = "E. G. Kogbetliantz",
title = "Computation of Arcsin {N} for $0<{N}<1$ Using an
Electronic Computer",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "218--222",
month = jul,
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0218",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.3X",
MRnumber = "19,1197c",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392625",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "C. B. Haselgrove",
}
@Article{Horton:1958:FBA,
author = "J. W. Horton and A. G. Anderson",
title = "A Full Binary Adder Employing Two Negative-Resistance
Diodes",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "223--231",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0223",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392626",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Norden:1958:CFM,
author = "P. V. Norden",
title = "Curve Fitting for a Model of Applied Research and
Development Scheduling",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "232--248",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0232",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392627",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1958:BRL,
author = "P. J. Price",
title = "The Bipolar Righi-Leduc Effect",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "249--251",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0249",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392628",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kronick:1958:MFP,
author = "H. E. Kronick",
title = "Magnetic Field Plotter for Superconducting Films",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "252--254",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0252",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392629",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "255--258",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0255",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392630",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "259--259",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0259",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392631",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "260--261",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.23.0260",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392632",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:CPFb,
author = "Anonymous",
title = "Contents of Previous Four Issues",
journal = j-IBM-JRD,
volume = "2",
number = "3",
pages = "262--263",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392633",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:43 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392633",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:TCd,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "265--265",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392635",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392635",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:BP,
author = "Anonymous",
title = "Breaker page",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "266--266",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392636",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392636",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:CCS,
author = "Anonymous",
title = "Conference on Communication of Scientific
Information",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "267--267",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1958.5392637",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392637",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wiesner:1958:CSU,
author = "J. B. Wiesner",
title = "Communication Sciences in a University Environment",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "268--275",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0268",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "20 \#6954",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392638",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Sherman",
xxtitle = "Communication science in a university environment",
}
@Article{deGrolier:1958:PSC,
author = "E. de Grolier",
title = "Problems in Scientific Communication",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "276--281",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0276",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392639",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Good:1958:HMS,
author = "I. J. Good",
title = "How Much Science Can You Have at Your Fingertips?",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "282--288",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0282",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00 (94.00)",
MRnumber = "21 \#449",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392640",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "M. L. Minsky",
}
@Article{Shannon:1958:CSI,
author = "C. E. Shannon",
title = "Channels with Side Information at the Transmitter",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "289--293",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0289",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "20 \#6951",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392641",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
author-dates = "Claude Elwood Shannon (April 30, 1916--February 24,
2001)",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. P. Lloyd",
}
@Article{David:1958:AAR,
author = "E. E. David",
title = "Artificial Auditory Recognition in Telephony",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "294--309",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0294",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392642",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Astrahan:1958:RLM,
author = "M. M. Astrahan",
title = "The Role of Large Memories in Scientific
Communications",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "310--313",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0310",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392643",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Luhn:1958:BIS,
author = "Hans Peter Luhn",
title = "A Business Intelligence System",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "314--319",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0314",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.00",
MRnumber = "20 \#3745",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/hash.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392644",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic abstract generation; checksum; hashing; KWIC
index",
}
@Article{Newell:1958:CPP,
author = "Allen Newell and J. C. Shaw and H. A. Simon",
title = "Chess-Playing Programs and the Problem of Complexity",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "320--335",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0320",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00 (90.00)",
MRnumber = "21 \#446",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392645",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Gorn",
}
@Article{Gelernter:1958:IBP,
author = "H. L. Gelernter and N. Rochester",
title = "Intelligent Behavior in Problem-Solving Machines",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "336--345",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0336",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00",
MRnumber = "23 \#B3114",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392646",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. Simon",
}
@Article{Elias:1958:CPN,
author = "P. Elias",
title = "Computation in the Presence of Noise",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "346--353",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0346",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "20 \#3043",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392647",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Baxendale:1958:MMI,
author = "P. B. Baxendale",
title = "Machine-Made Index for Technical {Literature --- An}
Experiment",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "354--361",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0354",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392648",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "362--365",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0362",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392649",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "366--366",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0366",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392650",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1958:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "2",
number = "4",
pages = "367--368",
month = "????",
year = "1958",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.24.0367",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:45 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392651",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Doyle:1959:AFR,
author = "R. H. Doyle and R. A. Meyer and R. P. Pedowitz",
title = "Automatic Failure Recovery in a Digital Data
Processing System",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "2--12",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392585",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swanson:1959:DAPa,
author = "J. A. Swanson",
title = "Diffusion Attenuation, {Part I}",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "13--17",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0013",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392586",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swanson:1959:DAPb,
author = "J. A. Swanson and K. Y. Sih",
title = "Diffusion Attenuation, {Part II}",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "18--24",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0018",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392587",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shapiro:1959:MTE,
author = "H. S. Shapiro and D. L. Slotnick",
title = "On the Mathematical Theory of Error-Correcting Codes",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "25--34",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0025",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "20 \#5092",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392588",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Strickland:1959:TEC,
author = "P. R. Strickland",
title = "The Thermal Equivalent Circuit of a Transistor",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "35--45",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0035",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392589",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dunham:1959:MBD,
author = "B. Dunham and D. Middleton and J. H. North and J. A.
Sliter and J. W. Weltzien",
title = "The Multipurpose Bias Device --- {Part II}: {The}
Efficiency of Logical Elements",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "46--53",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0046",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392590",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sopka:1959:AAI,
author = "J. J. Sopka",
title = "An Analysis of Adequate Inventory Levels",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "54--57",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0054",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.00",
MRnumber = "21 \#7118",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392591",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. Scarf",
}
@Article{Flehinger:1959:TPL,
author = "B. J. Flehinger and P. A. Lewis",
title = "Two-Parameter Lifetime Distributions for Reliability
Studies of Renewal Processes",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "58--73",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0058",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "62.00",
MRnumber = "20 \#6765",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392592",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "Z. W. Birnbaum",
}
@Article{Hopner:1959:EMD,
author = "E. Hopner",
title = "An Experimental Modulation-Demodulation Scheme for
High-Speed Data Transmission",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "74--84",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0074",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392593",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koves:1959:APC,
author = "G. Koves",
title = "Application of Phase-Contrast Metallography in a
Production Laboratory",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "85--92",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0085",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392594",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shevel:1959:ORS,
author = "W. Lee Shevel",
title = "Observations of Rotational Switching in Ferrites",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "93--95",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0093",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392595",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "96--100",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0096",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392596",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "101--102",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0101",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392597",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "3",
number = "1",
pages = "103--104",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.31.0103",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:48 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392598",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hunter:1959:DMA,
author = "L. P. Hunter",
title = "Direct Measurement of the Angular Dependence of the
Imaginary Part of the Atomic Scattering Factor of
Germanium",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "106--113",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0106",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392600",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rabin:1959:FAT,
author = "M. O. Rabin and D. Scott",
title = "Finite Automata and Their Decision Problems",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "114--125",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0114",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93.00 (02.00)",
MRnumber = "21 \#2559",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/string-matching.bib;
http://www.research.ibm.com/journal/",
note = "This paper shows the equivalence of deterministic and
nondeterministic finite automata.",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392601",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. McCarthy",
}
@Article{Cole:1959:IFC,
author = "H. Cole",
title = "Interatomic-Force Constants from a Central-Force Law",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "126--131",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0126",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392602",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Duijvestijn:1959:TSN,
author = "A. J. W. Duijvestijn",
title = "On the Transition from Superconducting to Normal
Phase, Accounting for Latent Heat and Eddy Currents",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "132--139",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0132",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392603",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reeber:1959:GES,
author = "M. D. Reeber",
title = "Geometric Effects in the Superconducting Transition of
Thin Films",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "140--146",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0140",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392604",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kogbetliantz:1959:CSC,
author = "E. G. Kogbetliantz",
title = "Computation of $\sin{N}$, $\cos{N}$, and ${M}$th Root
of ${N}$ Using an Electronic Computer",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "147--152",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0147",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.00",
MRnumber = "21 \#964",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "garbo.uwasa.fi:/pc/doc-soft/fpbiblio.txt;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392605",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "B. A. Chartres",
}
@Article{Smith:1959:MRG,
author = "W. V. Smith and J. Overmeyer and B. A. Calhoun",
title = "Microwave Resonance in Gadolinium-Iron Garnet
Crystals",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "153--162",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0153",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392606",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Peterson:1959:CCL,
author = "W. W. Peterson and M. O. Rabin",
title = "On Codes for Checking Logical Operations",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "163--168",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0163",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "21 \#1918",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392607",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Kochen:1959:EMS,
author = "M. Kochen",
title = "Extension of {Moore-Shannon} model for relay
circuits",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "169--186",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0169",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93.00 (60.00)",
MRnumber = "20 \#7597",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392608",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "E. F. Moore",
}
@Article{Sugai:1959:NSL,
author = "I. Sugai",
title = "Numerical solution of {Laplace}'s equation, given
{Cauchy} conditions",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "187--188",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0187",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.00",
MRnumber = "21 \#1709",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392609",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "M. A. Hyman",
}
@Article{Rosenberger:1959:CO,
author = "G. B. Rosenberger",
title = "A Cryogenic Oscillator",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "189--190",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0189",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392610",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1959:NTH,
author = "P. J. Price",
title = "Noise Theory for Hot Electrons",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "191--193",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0191",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392611",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marcus:1959:DEL,
author = "M. P. Marcus",
title = "Doubling the Efficiency of the Load-Sharing Matrix
Switch",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "194--196",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0194",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392612",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Erdos:1959:EDN,
author = "P. Erd{\H{o}}s",
title = "Elementary Divisors of Normal Matrices",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "197--197",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0197",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "15.00",
MRnumber = "20 \#7034",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392613",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. Schwerdtfeger",
}
@Article{Shepherdson:1959:RTW,
author = "J. C. Shepherdson",
title = "The Reduction of Two-Way Automata to One-Way
Automata",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "198--200",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0198",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93.00 (02.00)",
MRnumber = "21 \#2560",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/string-matching.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392614",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. McCarthy",
}
@Article{Anonymous:1959:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "201--204",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0201",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392615",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "205--206",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0205",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392616",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "3",
number = "2",
pages = "207--208",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.32.0207",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:50 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392617",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Samuel:1959:SSM,
author = "A. L. Samuel",
title = "Some Studies in Machine Learning Using the Game of
Checkers",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "210--229",
month = apr,
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0210",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00 (92.00)",
MRnumber = "22 \#2037",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Reprinted in E. A. Feigenbaum and J. Feldman (Eds.)
1963, {\em Computers and Thought}, McGraw-Hill, New
York",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392560",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ref = "Q37",
reviewer = "S. Gorn",
}
@Article{Rutz:1959:SPE,
author = "R. F. Rutz and D. F. Singer",
title = "Some Properties of Experimental {1000-Mc}
Transistors",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "230--236",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0230",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392561",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gross:1959:GFL,
author = "W. A. Gross",
title = "A gas film lubrication study. {I}. {Some} theoretical
analyses of slider bearings",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "237--255",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0237",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76.00",
MRnumber = "21 \#4682",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392562",
ZMnumber = "108.39302",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "L. N. Tao",
}
@Article{Michael:1959:GFL,
author = "W. A. Michael",
title = "A gas film lubrication study. {II}: {Numerical}
solution of the {Reynolds} equation for finite slider
bearings",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "256--259",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0256",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76.00",
MRnumber = "21 \#4683",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392563",
ZMnumber = "108.39303",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "L. N. Tao",
}
@Article{Brunner:1959:GFL,
author = "R. K. Brunner and J. M. Harker and K. E. Haughton and
A. G. Osterlund",
title = "A gas film lubrication study. {III}: {Experimental}
investigation of pivoted slider bearings",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "260--274",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0260",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76.00",
MRnumber = "21 \#4684",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392564",
ZMnumber = "108.39401",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "L. N. Tao",
}
@Article{Bennett:1959:ERO,
author = "C. A. Bennett",
title = "Experiments on The Relation of the Operator to the
Control Loop Of an Airborne Digital Computer",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "275--281",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0275",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392565",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Friedberg:1959:LMP,
author = "R. M. Friedberg and B. Dunham and J. H. North",
title = "A Learning Machine: {Part II}",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "282--287",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0282",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.40",
MRnumber = "23 \#B1074",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392566",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "M. L. Minsky",
}
@Article{Blaauw:1959:ICW,
author = "G. A. Blaauw",
title = "Indexing and Control-Word Techniques",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "288--301",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0288",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00",
MRnumber = "21 \#4569",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392567",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "IBM 7030 Stretch",
reviewer = "D. E. Muller",
}
@Article{Anonymous:1959:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "302--306",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0302",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392568",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "307--308",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0307",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392569",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "3",
number = "3",
pages = "309--310",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.33.0309",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:52 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392570",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:SNA,
author = "Anonymous",
title = "Some New Aspects of Color Perception",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "312--325",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0312",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392572",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roth:1959:ATM,
author = "J. Paul Roth and E. G. Wagner",
title = "Algebraic topological methods for the synthesis of
switching systems. {III}. {Minimization} of nonsingular
{Boolean} trees",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "326--344",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0326",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93.00 (06.00)",
MRnumber = "22 \#5513",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392573",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. B. Giever",
}
@Article{Kroll:1959:TFS,
author = "N. M. Kroll and I. Palocz",
title = "Theory of a Fast-Switching Electron-Beam Frequency
Divider",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "345--354",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0345",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392574",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greenstadt:1959:RCP,
author = "J. Greenstadt",
title = "On the reduction of continuous problems to discrete
form",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "355--363",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0355",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.00",
MRnumber = "21 \#6705",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392575",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. F. Weinberger",
}
@Article{Price:1959:ET,
author = "P. J. Price and J. M. Radcliffe",
title = "{Esaki} Tunneling",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "364--371",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0364",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392576",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rutz:1959:MLP,
author = "R. F. Rutz",
title = "A {3000-Mc} Lumped-Parameter Oscillator Using an
{Esaki} Negative-Resistance Diode",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "372--374",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0372",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392577",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dietrich:1959:MMR,
author = "W. Dietrich and W. E. Proebster",
title = "Millimicrosecond Magnetization Reversal in Thin
Magnetic Films",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "375--376",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0375",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392578",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Klein:1959:GPT,
author = "M. Klein and A. P. Kordalewski",
title = "Germanium {PNPN} Thyratron",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "377--379",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392579",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "380--385",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0380",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392580",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "386--387",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0386",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392581",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "388--389",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.34.0388",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392582",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1959:CPF,
author = "Anonymous",
title = "Contents of Previous Four Issues",
journal = j-IBM-JRD,
volume = "3",
number = "4",
pages = "390--390",
month = "????",
year = "1959",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1959.5392583",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:54 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392583",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wang:1960:TMM,
author = "Hao Wang",
title = "Toward Mechanical Mathematics",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "2--22",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00 (02.00)",
MRnumber = "22 \#4129",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392526",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P. C. Gilmore",
}
@Article{Jones:1960:TTD,
author = "R. E. Jones",
title = "A Thermodynamic Treatment of Dilute Superconducting
Alloys",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "23--27",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0023",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392527",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gilmore:1960:PMQ,
author = "P. C. Gilmore",
title = "A proof method for quantification theory: its
justification and realization",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "28--35",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0028",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00",
MRnumber = "23 \#B3113",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392528",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Miranker:1960:WEM,
author = "W. L. Miranker",
title = "The Wave Equation in a Medium in Motion",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "36--42",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0036",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "73.00 (35.00)",
MRnumber = "22 \#1178",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392529",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. W. Craggs",
}
@Article{MacDonald:1960:DMM,
author = "J. E. MacDonald",
title = "Design methods for maximum minimum-distance
error-correcting codes",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "43--57",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0043",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "22 \#1471",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392530",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Melas:1960:NGC,
author = "C. M. Melas",
title = "A new group of codes for correction of dependent
errors in data transmission",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "58--65",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0058",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "22 \#1470",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392531",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Watanabe:1960:ITAa,
author = "Satosi Watanabe",
title = "Information Theoretical Analysis of Multivariate
Correlation",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "66--82",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0066",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00 (62.00)",
MRnumber = "22 \#641",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392532",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Kullback",
}
@Article{Anonymous:1960:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "83--88",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0083",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392533",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "89--90",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0089",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392534",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "91--91",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.41.0091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392535",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:CPFa,
author = "Anonymous",
title = "Contents of Previous Four Issue",
journal = j-IBM-JRD,
volume = "4",
number = "1",
pages = "92--92",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1960.5392536",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:56 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392536",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pugh:1960:F,
author = "E. W. Pugh",
title = "Foreword",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "94--95",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0094",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392538",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Methfessel:1960:DWT,
author = "S. Methfessel and S. Middelhoek and H. Thomas",
title = "Domain Walls in Thin Ni-Fe Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "96--106",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0096",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392539",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Erlbach:1960:MMF,
author = "E. Erlbach and R. L. Garwin and M. P. Sarachik",
title = "Measurement of Magnetic-Field Attenuation By Thin
Superconducting Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "107--115",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0107",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392540",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boyd:1960:MAS,
author = "E. L. Boyd",
title = "Magnetic Anisotropy in Single-Crystal Thin Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "116--129",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0116",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392541",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Caswell:1960:ARG,
author = "H. L. Caswell",
title = "Analysis of the Residual Gases in Several Types of
High-Vacuum Evaporators",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "130--142",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392542",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ham:1960:EPT,
author = "F. S. Ham and D. C. Mattis",
title = "Electrical Properties of Thin-Film Semiconductors",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "143--151",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0143",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392543",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1960:ACS,
author = "P. J. Price",
title = "Anisotropic Conduction in Solids Near Surfaces",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "152--157",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0152",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392544",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Friedman:1960:SEC,
author = "A. N. Friedman and S. H. Koenig",
title = "Size Effects for Conduction in Thin Bismuth Crystals",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "158--162",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0158",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392545",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pugh:1960:AIA,
author = "E. W. Pugh and E. L. Boyd and J. F. Freedman",
title = "Angle-of-Incidence Anisotropy in Evaporated
Nickel-Iron Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "163--172",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0163",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392546",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kahan:1960:STF,
author = "G. J. Kahan and R. B. DeLano and A. E. Brennemann and
R. T. C. Tsui",
title = "Superconducting Tin Films of Low Residual
Resistivity",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "173--183",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0173",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392547",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Behrndt:1960:IAM,
author = "M. E. Behrndt and R. H. Blumberg and G. R. Giedd",
title = "On the Influence of Aggregation on the Magnetic Phase
Transition of Evaporated Superconducting Thin Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "184--188",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0184",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392548",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dietrich:1960:NST,
author = "W. Dietrich and W. E. Proebster and P. Wolf",
title = "Nanosecond Switching in Thin Magnetic Films",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "189--196",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0189",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392549",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brennemann:1960:VCC,
author = "A. E. Brennemann",
title = "The Variation of Cryotron Current Amplification Factor
with Temperature [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "197--197",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0197",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392550",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Beckerman:1960:IEE,
author = "M. Beckerman and K. H. Behrndt",
title = "The Influence of Edge Effects on Domain Structure and
Coercive Force of Circular Nickel-Iron Films [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "198--201",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0198",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392551",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kuehler:1960:NEM,
author = "J. D. Kuehler",
title = "A New Electron Mirror Design [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "202--204",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0202",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392552",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:1960:MCS,
author = "R. S. Smith",
title = "Measurement of Crystallite Size and Strain of
Electroplated Films [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "205--207",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0205",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392553",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Watanabe:1960:ITAb,
author = "Satosi Watanabe",
title = "Information-Theoretical Aspects of Inductive and
Deductive Inference",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "208--231",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0208",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00 (68.00)",
MRnumber = "22 \#5503",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392554",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "I. J. Good",
}
@Article{Anonymous:1960:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "232--238",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0232",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392555",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "239--240",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0239",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392556",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "241--243",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.42.0241",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392557",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:CPFb,
author = "Anonymous",
title = "Contents of Previous Four Issues",
journal = j-IBM-JRD,
volume = "4",
number = "2",
pages = "244--244",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1960.5392558",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:35:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392558",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gunther-Mohr:1960:FPI,
author = "G. R. Gunther-Mohr",
title = "Foreword to papers in this issue [Vapor Growth]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "247--247",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0247",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392488",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marinace:1960:EVG,
author = "J. C. Marinace",
title = "Epitaxial Vapor Growth of {Ge} Single Crystals in a
Closed-Cycle Process",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "248--255",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0248",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392489",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{ORourke:1960:EPV,
author = "M. J. O'Rourke and J. C. Marinace and R. L. Anderson
and W. H. White",
title = "Electrical Properties of Vapor-Grown {Ge} Junctions",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "256--263",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0256",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392490",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1960:VGV,
author = "R. L. Anderson and M. J. O'Rourke",
title = "A Vapor-Grown Variable Capacitance Diode",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "264--268",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0264",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392491",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baker:1960:RSI,
author = "W. E. Baker and D. M. J. Compton",
title = "Radiotracer Studies of the Incorporation of Iodine
into Vapor-Grown Ge",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "269--274",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0269",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392492",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baker:1960:IVG,
author = "W. E. Baker and D. M. J. Compton",
title = "Incorporation of As Into Vapor-Grown Ge",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "275--279",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0275",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392493",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marinace:1960:TDV,
author = "J. C. Marinace",
title = "Tunnel Diodes by Vapor Growth of {Ge} on {Ge} and on
{GaAs} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "280--282",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0280",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392494",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1960:GGA,
author = "R. L. Anderson",
title = "Germanium-Gallium Arsenide Heterojunctions [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "283--287",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0283",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392495",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wajda:1960:EGS,
author = "E. S. Wajda and B. W. Kippenhan and W. H. White",
title = "Epitaxial Growth of Silicon [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "288--295",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0288",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392496",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baker:1960:IAV,
author = "W. E. Baker and D. M. J. Compton",
title = "Incorporation of {Au} into Vapor-Grown {Ge} [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "296--298",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0296",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392497",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Glang:1960:IID,
author = "R. Glang and B. W. Kippenhan",
title = "Impurity Introduction during Epitaxial Growth of
Silicon",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "299--301",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0299",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392498",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ingham:1960:DCE,
author = "H. S. Ingham and P. J. McDade",
title = "Dislocation Content in Epitaxially Vapor-Grown {Ge}
Crystals [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "302--304",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0302",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392499",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swanson:1960:PVL,
author = "J. A. Swanson",
title = "Physical versus Logical Coupling in Memory Systems",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "305--310",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0305",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00 (68.00)",
MRnumber = "22 \#5504",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392500",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "I. J. Good",
}
@Article{Chien:1960:SCN,
author = "R. T. Chien",
title = "Synthesis of a Communication Net",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "311--320",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0311",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.00",
MRnumber = "22 \#13298",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392501",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. T. Tutte",
}
@Article{Mayeda:1960:SSF,
author = "W. Mayeda",
title = "Synthesis of switching functions by linear graph
theory",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "321--328",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0321",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05.00 (93.00)",
MRnumber = "22 \#12054",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392502",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "F. Harary",
}
@Article{Meggitt:1960:ECC,
author = "J. E. Meggitt",
title = "Error correcting codes for correcting bursts of
errors",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "329--334",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0329",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00",
MRnumber = "22 \#13358",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392503",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "F. L. Bauer",
}
@Article{Dickinson:1960:CRS,
author = "W. E. Dickinson",
title = "A Character-Recognition Study",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "335--348",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0335",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392504",
ZMnumber = "091.12402",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Thun:1960:DA,
author = "R. E. Thun",
title = "On Dimensional Analysis",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "349--356",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0349",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "70.00 (78.00)",
MRnumber = "22 \#5151",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392505",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "A. D. Booth",
}
@Article{Partovi:1960:NPU,
author = "F. Partovi",
title = "Note on Perturbation of a Uniform Magnetic Field by a
Cube of Magnetic Material [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "357--358",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0357",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392506",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McCurry:1960:SCL,
author = "R. E. McCurry and R. M. Schaffert",
title = "Space-Charge-Limited Currents in Resin Films [Letter
to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "359--363",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0359",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392507",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Melas:1960:CCD,
author = "C. M. Melas",
title = "A Cyclic Code for Double Error Correction [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "364--366",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0364",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392508",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "367--373",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0367",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392509",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "374--374",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0374",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392510",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "4",
number = "3",
pages = "375--376",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.43.0375",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:01 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392511",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greenberg:1960:FAM,
author = "H. J. Greenberg",
title = "{Fourier} analysis of the motion of a hydraulically
controlled piston",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "378--390",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0378",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76.42",
MRnumber = "26 \#989",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392513",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "A. F. Pillow",
}
@Article{Landauer:1960:SWN,
author = "R. Landauer",
title = "Shock waves in nonlinear transmission lines and their
effect on parametric amplification",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "391--401",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0391",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "78.00",
MRnumber = "22 \#9087",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392514",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "L. A. Pipes",
}
@Article{Nethercot:1960:STS,
author = "A. H. Nethercot",
title = "On the Switching Time of Subharmonic Oscillators",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "402--406",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0402",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392515",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dorn:1960:DTC,
author = "William S. Dorn",
title = "A Duality Theorem for Convex Programs",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "407--413",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0407",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.00",
MRnumber = "22 \#5492",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392516",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "D. Gale",
}
@Article{Chien:1960:CON,
author = "R. T. Chien",
title = "A Class of Optimal Noiseless Load-Sharing Matrix
Switches",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "414--417",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0414",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392517",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Constantine:1960:NDL,
author = "G. Constantine",
title = "New Developments in Load-Sharing Matrix Switches
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "418--422",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0418",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392518",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Carroll:1960:HSC,
author = "W. N. Carroll",
title = "High-Speed Counter Requiring No Carry Propagation
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "423--425",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0423",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392519",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{OConnell:1960:IBV,
author = "J. A. O'Connell and B. Narken",
title = "Increasing the Brightness-Voltage Nonlinearity of
Electroluminescent Devices [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "426--429",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0426",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392520",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Becker:1960:DCV,
author = "C. Becker and C. M. Bruen and R. B. Turner",
title = "Determining Component Variation for Gradual Transition
between Dissimilar Impedances [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "430--438",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0430",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392521",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "439--448",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0439",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392522",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "449--450",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0449",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392523",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "4",
number = "4",
pages = "451--452",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.44.0451",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392524",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tucker:1960:FCP,
author = "A. W. Tucker",
title = "Foreword [Combinatorial Problems]",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "454--454",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0454",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392457",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fulkerson:1960:TTR,
author = "D. R. Fulkerson and H. J. Ryser",
title = "Traces, Term Ranks, Widths and Heights",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "455--459",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0455",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "15.45",
MRnumber = "27 \#4819",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392458",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. Bays",
}
@Article{Hall:1960:AST,
author = "Marshall {Hall, Jr.}",
title = "Automorphisms of {Steiner} Triple Systems",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "460--472",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0460",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "50.60",
MRnumber = "23 \#A1282",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392459",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. B. Mann",
}
@Article{Riordan:1960:ETH,
author = "J. Riordan",
title = "The Enumeration of Trees by Height and Diameter",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "473--478",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0473",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05.45",
MRnumber = "25 \#3854",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392460",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. A. Dirac",
}
@Article{Miller:1960:MPR,
author = "R. E. Miller and J. L. Selfridge",
title = "Maximal Paths on Rectangular Boards",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "479--486",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0479",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05.24",
MRnumber = "23 \#A1556",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392461",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "B. W. Jones",
}
@Article{Hoffman:1960:ECC,
author = "A. J. Hoffman",
title = "On the exceptional case in a characterization of the
arcs of a complete graph",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "487--496",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0487",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05.65",
MRnumber = "25 \#3861",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392462",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. A. Dirac",
}
@Article{Hoffman:1960:MGD,
author = "A. J. Hoffman and R. R. Singleton",
title = "On {Moore} graphs with diameters $2$ and $3$",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "497--504",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0497",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05.40",
MRnumber = "25 \#3857",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392463",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. A. Dirac",
}
@Article{Dantzig:1960:IPS,
author = "G. B. Dantzig",
title = "Inductive Proof of the Simplex Method",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "505--506",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0505",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.50",
MRnumber = "23 \#B1596",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392464",
ZMnumber = "129.33905",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tucker:1960:SMG,
author = "A. W. Tucker",
title = "Solving a Matrix Game by Linear Programming",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "507--517",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0507",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.70",
MRnumber = "24 \#B410",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392465",
ZMnumber = "114.12405",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. H. Griesmer",
}
@Article{Kuhn:1960:SCL,
author = "H. W. Kuhn",
title = "Some Combinatorial Lemmas in Topology",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "518--524",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0518",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "54.85",
MRnumber = "23 \#A1358",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392466",
ZMnumber = "109.15603",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. S. Young",
}
@Article{Moore:1960:MCR,
author = "Edward F. Moore",
title = "Minimal Complete Relay Decoding Networks",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "525--531",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0525",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "24 \#B453",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392467",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. H. Griesmer",
xxpages = "524--531",
}
@Article{Griesmer:1960:BEC,
author = "J. H. Griesmer",
title = "A Bound for Error-Correcting Codes",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "532--542",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0532",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "23 \#B3081",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392468",
ZMnumber = "234.94009",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roth:1960:MBT,
author = "J. Paul Roth",
title = "Minimization over {Boolean} Trees",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "543--558",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0543",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392469",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roth:1960:PMB,
author = "J. Paul Roth",
title = "Minimization over {Boolean} trees",
journal = j-IBM-JRD,
volume = "4",
number = "??",
pages = "543--558",
year = "1960",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "25 \#4942",
bibdate = "Tue Sep 11 16:25:33 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. A. Dirac",
}
@Article{Anonymous:1960:Ae,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "559--560",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.45.0559",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392470",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1960:CPT,
author = "Anonymous",
title = "Contents of Previous Two Issues",
journal = j-IBM-JRD,
volume = "4",
number = "5",
pages = "561--561",
month = "????",
year = "1960",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1960.5392471",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:06 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392471",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Miranker:1961:PSW,
author = "W. L. Miranker",
title = "Periodic solutions of the wave equation with a
nonlinear interface condition",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "2--24",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "78.00",
MRnumber = "22 \#9080",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392473",
ZMnumber = "148.08405",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "V. M. Papadopoulos",
}
@Article{Kennedy:1961:TCM,
author = "D. P. Kennedy",
title = "Theoretical Current Multiplication of a Cylindrical
Hook Collector",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "25--32",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0025",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392474",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hellerman:1961:MAC,
author = "L. Hellerman and E. J. Skiko",
title = "Methods of Analysis of Circuit Transient Performance",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "33--43",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0033",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392475",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Titcomb:1961:ACI,
author = "S. C. Titcomb",
title = "Analysis of a Constant-Input-Flow Hydraulic System",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "44--55",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0044",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392476",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1961:SSO,
author = "P. P. Sorokin and M. J. Stevenson",
title = "Solid-State Optical Maser Using Divalent Samarium in
Calcium Fluoride [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "56--58",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0056",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392477",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McDermid:1961:MAM,
author = "W. L. McDermid and H. E. Petersen",
title = "A Magnetic Associative Memory System [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "59--62",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0059",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392478",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1961:AMM,
author = "P. J. Price and Yi-Han Kao",
title = "Acoustic-Mode Mobilities for {``Split-p--Silicon''}
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "63--64",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0063",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392479",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Keyes:1961:HLI,
author = "R. W. Keyes",
title = "Hydrogen-like Impurity States in Axially Symmetric
Crystals [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "65--66",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0065",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392480",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Foglia:1961:CCS,
author = "H. R. Foglia and W. L. McDermid and H. E. Petersen",
title = "Card Capacitor --- a Semipermanent, Read Only Memory
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "67--68",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0067",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392481",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chambers:1961:SXR,
author = "F. Chambers and M. Okrasinski and H. Cole",
title = "Safe {X}-Ray Shutter and Filter System [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "69--70",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0069",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392482",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "71--78",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0071",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392483",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "79--80",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0079",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392484",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "81--82",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.51.0081",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392485",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:CPF,
author = "Anonymous",
title = "Contents of Previous Five Issues",
journal = j-IBM-JRD,
volume = "5",
number = "1",
pages = "83--84",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1961.5392486",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392486",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{King:1961:TLP,
author = "Gilbert W. King",
title = "Table Look-up Procedures in Language Processing ---
{Part I}: The Raw Text",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "86--92",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0086",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.00 (68.00)",
MRnumber = "22 \#12005",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392434",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "A. G. Oettinger",
}
@Article{Hopner:1961:PRD,
author = "E. Hopner",
title = "Phase Reversal Data Transmission System for Switched
and Private Telephone Line Applications",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "93--105",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0093",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392435",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kiseda:1961:MAM,
author = "J. R. Kiseda and H. E. Petersen and W. C. Seelbach and
M. Teig",
title = "A Magnetic Associative Memory",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "106--121",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0106",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392436",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tiersten:1961:AMS,
author = "M. Tiersten",
title = "Acoustic-Mode Scattering of Holes",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "122--131",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0122",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392437",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boudreau:1961:ABQ,
author = "P. E. Boudreau and M. Kac",
title = "Analysis of a basic queuing problem arising in
computer systems",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "132--140",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0132",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60.00",
MRnumber = "22 \#10027",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392438",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. Riordan",
}
@Article{Welch:1961:DDM,
author = "P. D. Welch",
title = "A Direct Digital Method of Power Spectrum Estimation",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "141--156",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0141",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392439",
ZMnumber = "097.33405",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lasher:1961:DSO,
author = "G. J. Lasher",
title = "The dynamics of a subharmonic oscillator with linear
dissipation",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "157--161",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0157",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "70.00",
MRnumber = "22 \#12773",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392440",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "S. P. Diliberto",
}
@Article{Anonymous:1961:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "162--169",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0162",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392441",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "170--171",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0170",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392442",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "5",
number = "2",
pages = "172--173",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.52.0172",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392443",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rhodes:1961:MFC,
author = "W. H. Rhodes and L. A. Russell and F. E. Sakalay and
R. M. Whalen",
title = "A 0.7-Microsecond Ferrite Core Memory",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "174--182",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0174",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392445",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Landauer:1961:IHG,
author = "R. Landauer",
title = "Irreversibility and heat generation in the computing
process",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "183--191",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0183",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00",
MRnumber = "24 \#B885",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392446",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "L. G. Napolitano",
}
@Article{Craft:1961:TLM,
author = "J. L. Craft and E. H. Goldman and W. B. Strohm",
title = "A table look-up machine for processing of natural
languages",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "192--203",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0192",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392447",
ZMnumber = "112.08602",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Leibowitz:1961:AMT,
author = "M. A. Leibowitz",
title = "An approximate method for treating a class of
multiqueue problems",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "204--209",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0204",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60.80",
MRnumber = "23 \#A1406",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392448",
ZMnumber = "117.13502",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. Riordan",
}
@Article{Swanson:1961:NCP,
author = "John A. Swanson",
title = "Notes on Cumulative Photovoltages",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "210--217",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0210",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392449",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sprokel:1961:URD,
author = "G. J. Sprokel",
title = "The Use of Radioisotopes to Determine the Chemistry of
Solder Flux",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "218--225",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0218",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392450",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Moser:1961:BSD,
author = "J. K. Moser",
title = "Bistable systems of differential equations with
applications to tunnel diode circuits",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "226--240",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0226",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "23 \#B1614",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392451",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. P. LaSalle",
}
@Article{Marcus:1961:MPD,
author = "M. P. Marcus",
title = "Minimum Polarized Distance Codes",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "241--248",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0241",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392452",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "249--260",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0249",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392453",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "261--262",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0261",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392454",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "5",
number = "3",
pages = "263--264",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.53.0263",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392455",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Keyes:1961:ECE,
author = "R. W. Keyes",
title = "The Electronic Contribution to the Elastic Properties
of Germanium",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "266--278",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0266",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392388",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dew-Hughes:1961:DPF,
author = "D. Dew-Hughes",
title = "Dislocations and Plastic Flow in Germanium",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "279--286",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0279",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392389",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hoagland:1961:HTD,
author = "A. S. Hoagland",
title = "A High Track-Density Servo-Access System for Magnetic
Recording Disk Storage",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "287--296",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0287",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392390",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nowick:1961:LDFa,
author = "A. S. Nowick and B. S. Berry",
title = "Lognormal Distribution Function for Describing
Anelastic and Other Relaxation Processes {I}. Theory
and Numerical Computations",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "297--311",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0297",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392391",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nowick:1961:LDFb,
author = "A. S. Nowick and B. S. Berry",
title = "Lognormal Distribution Function for Describing
Anelastic and Other Relaxation Processes {II}. Data
Analysis and Applications",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "312--320",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0312",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392392",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fan:1961:SPP,
author = "George J. Fan",
title = "A Study of the Playback Process of a Magnetic Ring
Head",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "321--325",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0321",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392393",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koehler:1961:NHP,
author = "H. Koehler and B. Kostyshyn and T. C. Ku",
title = "A Note on {Hall} Probe Resolution [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "326--327",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0326",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392394",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yu:1961:CNC,
author = "H. N. Yu",
title = "The Chargistor, a New Class of Semiconductor Devices
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "328--330",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0328",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392395",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1961:MCA,
author = "D. P. Kennedy",
title = "{Monte Carlo} Analysis of Transistor Diffusion
Techniques [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "331--334",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0331",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392396",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Palermo:1961:NMP,
author = "F. P. Palermo",
title = "A Network Minimization Problem [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "335--337",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0335",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392397",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published in Other Journals",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "338--348",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0338",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392398",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "349--350",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0349",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392399",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1961:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "5",
number = "4",
pages = "351--352",
month = "????",
year = "1961",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.54.0351",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:10:36 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392400",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marcus:1962:FPI,
author = "P. M. Marcus",
title = "Foreword to papers in this issue [Fundamental Research
in Superconductivity]",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "2--2",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392402",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:FRS,
author = "Anonymous",
title = "Fundamental research in superconductivity",
journal = j-IBM-JRD,
volume = "6",
number = "??",
pages = "3--11",
year = "1962",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 12:01:15 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "114.22803",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxnote = "Check pages: overlap with \cite{Bardeen:1962:RPS}.",
}
@Article{Bardeen:1962:RPS,
author = "J. Bardeen",
title = "Review of the present status of the theory of
superconductivity",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "3--11",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0003",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "81.99",
MRnumber = "25 \#2856",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392403",
ZMnumber = "114.22802",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "B. P. Nigam",
xxnote = "Check pages: overlap with
\cite{Anonymous:1962:FRS,vonHagenow:1962:IFP}.",
}
@Article{vonHagenow:1962:IFP,
author = "K. U. {von Hagenow} and H. Koppe",
title = "On the influence of free path on the {Meissner}
effect",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "12--13",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0012",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "81.99",
MRnumber = "24 \#B1163",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392404",
ZMnumber = "114.22804",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxnote = "Check pages: overlap with \cite{Bardeen:1962:RPS}. ZM
has pages 3--11??",
}
@Article{Swihart:1962:SBI,
author = "J. C. Swihart",
title = "Solutions of the {BCS} integral equation and
deviations from the law of corresponding states",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "14--23",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0014",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "81.45 (81.65)",
MRnumber = "24 \#B1569",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392405",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. M. Blatt",
}
@Article{Masuda:1962:NSR,
author = "Yoshika Masuda",
title = "Nuclear Spin Relaxation in Superconducting Cadmium",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "24--26",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0024",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392406",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mendelssohn:1962:EWS,
author = "K. Mendelssohn",
title = "Experimental Work on Superconductivity",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "27--30",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0027",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392407",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Little:1962:KRM,
author = "W. A. Little",
title = "The {Kapitza} Resistance of Metals in the Normal and
Superconducting States",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "31--33",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0031",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392408",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shapiro:1962:SET,
author = "S. Shapiro and P. H. Smith and J. Nicol and J. L.
Miles and P. F. Strong",
title = "Superconductivity and Electron Tunneling",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "34--43",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0034",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392409",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Douglass:1962:MFD,
author = "D. H. Douglass",
title = "Magnetic Field Dependence of the Superconducting
Energy Gap in {Ginzburg--Landau} Theory with
Application to Al",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "44--48",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0044",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392410",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tinkham:1962:DEG,
author = "M. Tinkham",
title = "Dependence of the Energy Gap in Superconductors on
Position and Magnetic Field",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "49--54",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0049",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392411",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ginsberg:1962:FIA,
author = "D. M. Ginsberg and J. D. Leslie",
title = "Far-Infrared Absorption in a Lead-Thallium
Superconducting Alloy",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "55--57",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0055",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392412",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Morse:1962:UAS,
author = "R. W. Morse",
title = "Ultrasonic Attenuation in Superconductors",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "58--62",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0058",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392413",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Goodman:1962:MBS,
author = "B. B. Goodman",
title = "The Magnetic Behavior of Superconductors of Negative
Surface Energy",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "63--67",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0063",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392414",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coles:1962:EEC,
author = "B. R. Coles",
title = "Effects of Electron Concentration and Mean Free Path
on the Superconducting Behavior of Alloys",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "68--70",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0068",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392415",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meissner:1962:SEE,
author = "H. Meissner",
title = "Surface Energy Effects at the Boundary between a
Superconductor and a Normal Conductor",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "71--74",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0071",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392416",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cooper:1962:SET,
author = "L. N. Cooper",
title = "Some Elementary Theoretical Considerations Concerning
Superconductivity of Superimposed Metallic Films",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "75--76",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0075",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392417",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mapother:1962:TCM,
author = "D. E. Mapother",
title = "Thermodynamic Consistency of Magnetic and Calorimetric
Measurements on Superconductors",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "77--81",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0077",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392418",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swenson:1962:TPD,
author = "C. A. Swenson",
title = "The Temperature and Pressure Dependence of Critical
Field Curves",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "82--83",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0082",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392419",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andres:1962:MES,
author = "K. Andres and J. L. Olsen and H. Rohrer",
title = "Mechanical Effects at the Superconducting Transition",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "84--88",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0084",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392420",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Alers:1962:VEM,
author = "G. A. Alers and D. L. Waldorf",
title = "Variation of the Elastic Moduli at the Superconducting
Transition",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "89--93",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0089",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392421",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seraphim:1962:FSO,
author = "D. P. Seraphim and P. M. Marcus",
title = "First- and Second-Order Stress Effects on the
Superconducting Transitions of Tantalum and Tin",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "94--111",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0094",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392422",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chang:1962:TCD,
author = "G. K. Chang and R. E. Jones and A. M. Toxen",
title = "Thermal Conductivity of Dilute Indium-Mercury
Superconducting Alloys",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "112--115",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0112",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392423",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Blaugher:1962:SSI,
author = "R. D. Blaugher and A. Taylor and J. K. Hulm",
title = "The Superconductivity of Some Intermetallic
Compounds",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "116--118",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0116",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392424",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hake:1962:HFS,
author = "R. R. Hake and T. G. Berlincourt and D. H. Leslie",
title = "High-Field Superconductivity in Some bcc Ti-Mo and
Nb-Zr Alloys",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "119--121",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0119",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392425",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{LeBlanc:1962:ART,
author = "M. A. R. LeBlanc",
title = "Anomalous Resistive Transitions and New Phenomena in
Hard Superconductors",
journal = j-IBM-JRD,
volume = "6",
number = "1",
pages = "122--125",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.61.0122",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:25 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392426",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Axelrod:1962:SNH,
author = "M. S. Axelrod and A. S. Farber and D. E. Rosenheim",
title = "Some New High-Speed Tunnel-Diode Logic Circuits",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "158--169",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0158",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392351",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Esaki:1962:CTD,
author = "L. Esaki",
title = "Characterization of Tunnel Diode Performance in Terms
of Device Figure of Merit and Circuit Time Constant",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "170--178",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0170",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392352",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Uttal:1962:SES,
author = "W. R. Uttal and L. Cook",
title = "Systematics of the Evoked Somatosensory Cortical
Potential",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "179--191",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0179",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392353",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schaffert:1962:CTM,
author = "R. M. Schaffert",
title = "Charge Transport Mechanisms in the Transfer of Latent
Electrostatic Images to Dielectric Surfaces",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "192--199",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0192",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392354",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lyons:1962:UTM,
author = "R. E. Lyons and W. Vanderkulk",
title = "The Use of Triple-Modular Redundancy to Improve
Computer Reliability",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "200--209",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0200",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392355",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meggitt:1962:PDP,
author = "J. E. Meggitt",
title = "Pseudo Division and Pseudo Multiplication Processes",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "210--226",
month = apr,
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0210",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392356",
ZMnumber = "201.48709",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roth:1962:MBG,
author = "J. Paul Roth and R. M. Karp",
title = "Minimization Over {Boolean} Graphs",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "227--238",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0227",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "25 \#4969",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392357",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. Riordan",
}
@Article{Dorn:1962:GHR,
author = "William S. Dorn",
title = "Generalizations of {Horner}'s rule for polynomial
evaluation",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "239--245",
month = apr,
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0239",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.50",
MRnumber = "24 \#B2541",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/elefunt.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392358",
ZMnumber = "128.37202",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "D. H. Lehmer",
}
@Article{Schay:1962:AMM,
author = "G. {Schay, Jr.}",
title = "Approximate Methods for a Multiqueueing Problem",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "246--249",
month = apr,
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0246",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60.80",
MRnumber = "25 \#626",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392359",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "D. G. Kendall",
}
@Article{Matthias:1962:SF,
author = "B. T. Matthias",
title = "Superconductivity and Ferromagnetism",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "250--255",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0250",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392360",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Geballe:1962:IEL,
author = "T. H. Geballe and B. T. Matthias",
title = "Isotope Effects in Low Temperature Superconductors",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "256--257",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0256",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392361",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mattis:1962:IFP,
author = "D. C. Mattis",
title = "On the Influence of Free Path on the {Meissner} Effect
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "258--258",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0258",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392362",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tideman:1962:CAN,
author = "M. Tideman",
title = "Comment on {``A Network Minimization Problem''}
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "259--259",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0259",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392363",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Francis:1962:TSM,
author = "E. E. Francis and T. C. Ku",
title = "A Theoretical Solution for the Magnetic Field in the
Vicinity of a Recording Head Air Gap [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "260--262",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0260",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392364",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{LeMehaute:1962:ADI,
author = "C. {Le Mehaute}",
title = "Application of Differential Interferometry with Two
Polarized Beams [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "263--267",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0263",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392365",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rado:1962:CPF,
author = "T. Rado",
title = "Comments on the Presence Function of
{Gazal{\'e}} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "268--269",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0268",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392366",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kochen:1962:CPC,
author = "M. Kochen and E. Wong",
title = "Concerning the Possibility of a Cooperative
Information Exchange [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "270--271",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0270",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392367",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "272--284",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0272",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392368",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "284--285",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0284",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392369",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "6",
number = "2",
pages = "286--288",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.62.0286",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:28 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392370",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mach:1962:RSP,
author = "R. E. Mach and T. L. Gardner",
title = "Rectification of Satellite Photography by Digital
Techniques",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "290--305",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0290",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392372",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tasini:1962:MIO,
author = "B. B. Tasini and S. Winograd",
title = "Multiple Input-Output Links in Computer Systems",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "306--328",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0306",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392373",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Barlow:1962:DGL,
author = "E. J. Barlow and W. E. Langlois",
title = "Diffusion of Gas from a Liquid into an Expanding
Bubble",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "329--337",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0329",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392374",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brown:1962:SAS,
author = "L. S. Brown",
title = "Spin Absorption Spectra",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "338--347",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0338",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392375",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bate:1962:EEP,
author = "G. Bate and H. S. Templeton and J. W. Wenner",
title = "An Experiment on the Effect of Particle Orientation on
Peak Shift in Magnetic Tapes",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "348--352",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0348",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392376",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bonner:1962:APR,
author = "R. E. Bonner",
title = "A ``Logical Pattern'' Recognition Program",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "353--360",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0353",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:1962:OMC,
author = "A. W. Smith and N. Braslau",
title = "Optical Mixing of Coherent and Incoherent Light
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "361--362",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0361",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392378",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{MacDonald:1962:FET,
author = "R. E. MacDonald and M. J. Vogel and J. W. Brookman",
title = "Fluorescence of Europium Tungstate [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "363--364",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0363",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392379",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bernhard:1962:NNR,
author = "S. A. Bernhard and W. L. Duda",
title = "A Note on the Nature of {RNA} Codes [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "365--367",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0365",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392380",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dietrich:1962:PSP,
author = "W. Dietrich",
title = "Partial-Switching Processes in Thin Magnetic Films
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "368--371",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0368",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392381",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brock:1962:DOD,
author = "G. E. Brock and C. F. Aliotta",
title = "Direct Observation of Dislocation Loops in
Arsenic-Doped Germanium [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "372--374",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0372",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392382",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nathan:1962:EBM,
author = "M. I. Nathan and S. H. Moll",
title = "Electron Beam Microanalysis of Germanium Tunnel Diodes
[Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "375--377",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0375",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392383",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "378--388",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0378",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392384",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "389--390",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0389",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392385",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "6",
number = "3",
pages = "391--392",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.63.0391",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392386",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Middelhoek:1962:SRP,
author = "S. Middelhoek",
title = "Static Reversal Processes in Thin Ni-Fe Films",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "394--406",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0394",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392314",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boudreau:1962:DQP,
author = "P. E. Boudreau and J. S. {Griffin, Jr.} and M. Kac",
title = "A discrete queueing problem with variable service
times",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "407--418",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0407",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60.80",
MRnumber = "26 \#4424",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392315",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. Newell",
}
@Article{Chang:1962:ASQ,
author = "Hsu Chang",
title = "Analysis of Static and Quasidynamic Behavior of
Magnetostatically Coupled Thin Magnetic Films",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "419--429",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0419",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392316",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Winograd:1962:CLO,
author = "S. Winograd",
title = "Coding for Logical Operations",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "430--436",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0430",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "26 \#3542",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392317",
ZMnumber = "201.52903",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Horton:1962:ESE,
author = "J. W. Horton",
title = "Experimental Study of Electron-Beam Driven
Semiconductor Devices for Use in a Digital Memory",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "437--448",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0437",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392318",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Freedman:1962:RSS,
author = "J. F. Freedman",
title = "Residual Stress in Single-Crystal Nickel Films",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "449--455",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0449",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392319",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bebb:1962:PMM,
author = "H. B. Bebb",
title = "A Polarimetric Method of Measuring Magneto-Optic
Coefficients",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "456--461",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0456",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392320",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haskell:1962:PCC,
author = "J. W. Haskell",
title = "Printed Cards for the Card Capacitor Memory [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "462--463",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0462",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392321",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Segmuller:1962:DLS,
author = "A. Segmuller",
title = "Determination of Lattice Strain and Crystallite Size
in Thin Films [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "464--466",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0464",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392322",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mitchell:1962:DOS,
author = "W. L. Mitchell and C. Hays and R. E. Swift",
title = "Direct Observations of the Substructure Network in
Iron [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "467--469",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0467",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392323",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Leibowitz:1962:NSF,
author = "M. A. Leibowitz",
title = "A Note on Some Fundamental Parameters of Multiqueue
Systems [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "470--471",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0470",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392324",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ma:1962:EIA,
author = "J. T. S. Ma and P. K. C. Wang",
title = "Effect of Initial Air Content on the Dynamics of
Bubbles in Liquids [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "472--474",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0472",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392325",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "475--486",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0475",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392326",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "487--489",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0487",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392327",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "490--491",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.64.0490",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392328",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1962:CPT,
author = "Anonymous",
title = "Contents of previous three issues",
journal = j-IBM-JRD,
volume = "6",
number = "4",
pages = "492--492",
month = "????",
year = "1962",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1962.5392329",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 16:10:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392329",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meggitt:1963:DMP,
author = "J. E. Meggitt",
title = "Digit-by-digit methods for polynomials",
journal = j-IBM-JRD,
volume = "7",
number = "??",
pages = "237--245",
year = "1963",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.50",
MRnumber = "27 \#2100",
bibdate = "Tue Sep 11 16:25:43 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kamentsky:1963:CAD,
author = "L. A. Kamentsky and C. N. Liu",
title = "Computer-automated design of multifont print
recognition logic",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "2--13",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392331",
ZMnumber = "106.11408",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greanias:1963:RHN,
author = "E. C. Greanias and P. F. Meagher and R. J. Norman and
P. Essinger",
title = "The recognition of handwritten numerals by contour
analysis",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "14--21",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0014",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392332",
ZMnumber = "106.11409",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sierra:1963:IMR,
author = "H. M. Sierra",
title = "Increased Magnetic Recording Read-back Resolution by
Means of a Linear Passive Network",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "22--33",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0022",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392333",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ames:1963:APE,
author = "I. Ames and R. L. Christensen",
title = "Anomalous Photoelectric Emission from Nickel",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "34--39",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0034",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392334",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hudson:1963:STA,
author = "F. J. Hudson",
title = "Synthesis of Transfer Admittance Functions Using
Active Components",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "40--43",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0040",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392335",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shah:1963:IEO,
author = "M. J. Shah and C. M. Hart",
title = "Investigations of the Electro-Optical Birefringence of
Polydisperse Bentonite Suspensions",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "44--57",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0044",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392336",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lasher:1963:TRD,
author = "G. J. Lasher",
title = "Threshold Relations and Diffraction Loss for Injection
Lasers",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "58--61",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0058",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392337",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Burns:1963:DEG,
author = "G. Burns and R. A. Laff and S. E. Blum and F. H. Dill
and M. I. Nathan",
title = "Directionality Effects of {GaAs} Light-Emitting
Diodes: {Part I} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "62--63",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0062",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392338",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Laff:1963:DEG,
author = "R. A. Laff and W. P. Dumke and F. H. Dill and G.
Burns",
title = "Directionality Effects of {GaAs} Light-Emitting
Diodes: {Part II} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "63--65",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0063",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392339",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dumke:1963:EMP,
author = "W. P. Dumke",
title = "Electromagnetic Mode Population in Light-Emitting
Junctions [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "66--67",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0066",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392340",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Title:1963:PRS,
author = "R. S. Title",
title = "Paramagnetic Resonance of the Shallow Acceptors {Zn} and
{Cd} in {GaAs} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "68--69",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0068",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392341",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Michel:1963:DAR,
author = "A. E. Michel and E. J. Walker and M. I. Nathan",
title = "Determination of the Active Region in Light-Emitting
{GaAs} Diodes [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "70--71",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0070",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392342",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Burns:1963:RTS,
author = "G. Burns and M. I. Nathan",
title = "Room-Temperature Stimulated Emission [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "72--73",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0072",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392343",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Howard:1963:COG,
author = "W. E. Howard and F. F. Fang and F. H. Dill and M. I.
Nathan",
title = "{CW} Operation of a {GaAs} Injection Laser",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "74--75",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0074",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392344",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Crook:1963:ESH,
author = "M. N. Crook and D. S. Kellogg",
title = "Experimental Study of Human Factors for a Handwritten
Numeral Reader [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "76--78",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0076",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392345",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:ITPa,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "79--93",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0079",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392346",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:RIPa,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "94--96",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0094",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392347",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "97--99",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.71.0097",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392348",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:CPT,
author = "Anonymous",
title = "Contents of previous three issues",
journal = j-IBM-JRD,
volume = "7",
number = "1",
pages = "100--100",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1963.5392349",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:39:58 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392349",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gorog:1963:SNC,
author = "E. Gorog",
title = "Some new classes of cyclic codes used for burst-error
correction",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "102--111",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0102",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392284",
ZMnumber = "282.94011",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Langlois:1963:LLF,
author = "W. E. Langlois",
title = "The Lightly Loaded Foil Bearing at Zero Angle of
Wrap",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "112--116",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0112",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392285",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sato:1963:PTD,
author = "Yasuo Sato",
title = "Propagation of Torsional Disturbances in a Homogeneous
Elastic Sphere",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "117--120",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0117",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392286",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schay:1963:MKA,
author = "G. {Schay, Jr.} and N. Raver",
title = "A Method for Key-to-Address Transformation",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "121--126",
month = apr,
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0121",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392287",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hanan:1963:ACT,
author = "M. Hanan and F. P. Palermo",
title = "An Application of Coding Theory to a File Address
Problem",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "127--129",
month = apr,
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0127",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392288",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
annote = "Mathematical statement of direct access problem.
Polynomial hashing.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kump:1963:MUC,
author = "H. J. Kump and T. G. Greene",
title = "Magnetization of Uniaxial Cylindrical Thin Films",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "130--134",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392289",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sprokel:1963:LSC,
author = "G. J. Sprokel",
title = "A Liquid Scintillation Counter Using Anticoincidence
Shielding",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "135--145",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0135",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392290",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rudge:1963:FEL,
author = "W. E. Rudge and W. E. Harding and W. E. Mutter",
title = "Fly's-Eye Lens Technique for Generating Semiconductor
Device Fabrication Masks",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "146--150",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0146",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392291",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Melas:1963:NEC,
author = "C. M. Melas and E. Gorog",
title = "A Note on Extending Certain Codes to Correct Error
Bursts in Longer Messages",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "151--152",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0151",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392292",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baumeister:1963:NCF,
author = "H. K. Baumeister",
title = "Nominal Clearance of the Foil Bearing",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "153--154",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0153",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392293",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stevenson:1963:LWP,
author = "M. J. Stevenson and J. D. Axe and J. R. Lankard",
title = "Line Widths and Pressure Shifts in Mode Structure of
Stimulated Emission from {GaAs} Junctions",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "155--156",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0155",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392294",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Moll:1963:TCJ,
author = "J. L. Moll and J. F. Gibbons",
title = "Threshold Current for $p$-n Junction Lasers [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "157--159",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0157",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392295",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koves:1963:DOS,
author = "G. Koves and J. Pesch",
title = "On the Direct Observation of the Substructure Network
in Iron [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "160--162",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0160",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392296",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:ITPb,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "163--174",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0163",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392297",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "175--177",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0175",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392298",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "7",
number = "2",
pages = "178--180",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.72.0178",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:00 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392299",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buelow:1963:CPM,
author = "F. K. Buelow and F. B. Hartman and E. L. Willette and
J. J. Zasio",
title = "A Circuit Packaging Model for High-Speed Computer
Technology",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "182--189",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0182",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392301",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chung:1963:DAR,
author = "D. H. Chung and J. A. Palmieri",
title = "Design of {ACP} Resistor-Coupled Switching Circuits",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "190--198",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0190",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392302",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Crawford:1963:ITD,
author = "D. J. Crawford and W. D. Pricer and J. J. Zasio",
title = "An Improved Tunnel Diode Memory System",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "199--206",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0199",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392303",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ashar:1963:TAD,
author = "K. G. Ashar and H. N. Ghosh and A. W. Aldridge and L.
J. Patterson",
title = "Transient Analysis and Device Characterization of
{ACP} Circuits",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "207--223",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0207",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392304",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berger:1963:NME,
author = "J. M. Berger and Beno{\^\i}t Mandelbrot",
title = "A New Model for Error Clustering in Telephone
Circuits",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "224--236",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0224",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/bibnet/authors/m/mandelbrot-benoit.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392305",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxtitle = "A new model for the clustering of errors on telephone
circuits",
}
@Article{Meggitt:1963:DDM,
author = "J. E. Meggitt",
title = "Digit-by-Digit Methods for Polynomials",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "237--245",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0237",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392306",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bernhard:1963:ADA,
author = "S. A. Bernhard and D. F. Bradley and W. L. Duda",
title = "Automatic Determination of Amino Acid Sequences",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "246--251",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0246",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392307",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bland:1963:DCU,
author = "G. F. Bland",
title = "Directional Coupling and its Use for Memory Noise
Reduction",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "252--256",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0252",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392308",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dodd:1963:SAE,
author = "P. D. Dodd",
title = "A Simple Active Equivalent to a Lattice Pulse-Slimming
Filter [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "257--258",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0257",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392309",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:ITPc,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "259--272",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0259",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392310",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:RIPc,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "273--274",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0273",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392311",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "7",
number = "3",
pages = "275--276",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.73.0275",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:03 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392312",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gutzwiller:1963:NWP,
author = "M. C. Gutzwiller and W. L. Miranker",
title = "Nonlinear Wave Propagation in a Transmission Line
Loaded with Thin Permalloy Films",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "278--287",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392254",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tu:1963:TMS,
author = "Yih-O. Tu and H. Cohen",
title = "A Theoretical Model for Separation in the Fluid Jet
Amplifier",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "288--296",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0288",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392255",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jeppesen:1963:PLF,
author = "R. H. Jeppesen and H. L. Caswell",
title = "Prenucleation of Lead Films with Copper, Gold, and
Silver",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "297--302",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0297",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392256",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stuiver:1963:ANC,
author = "W. Stuiver and R. S. McDuffie",
title = "Analysis and Numerical Calculations of the Dynamic
Behavior of Plane Pivoted Slider Bearings",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "303--316",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0303",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392257",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Daher:1963:ACM,
author = "P. R. Daher",
title = "Automatic Correction of Multiple Errors Originating in
a Computer Memory",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "317--324",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0317",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392258",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dammann:1963:DDS,
author = "J. E. Dammann and E. J. Skiko and E. V. Weber",
title = "A Data Display Subsystem",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "325--333",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0325",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392259",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Keyes:1963:NAL,
author = "R. W. Keyes",
title = "Nonlinear Absorbers of Light",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "334--336",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0334",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392260",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tarnawsky:1963:TTI,
author = "G. O. Tarnawsky",
title = "Tagging Techniques for Incorporating Microglossaries
in an Automatic Dictionary",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "337--339",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0337",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392261",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Warten:1963:ASS,
author = "R. M. Warten",
title = "Automatic Step-Size Control for {Runge--Kutta}
Integration",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "340--341",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0340",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.61",
MRnumber = "27 \#6397",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392262",
ZMnumber = "133.38301",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. W. Hamming",
}
@Article{Harris:1963:HSP,
author = "T. J. Harris",
title = "High-Speed Photographs of Laser-Induced Heating",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "342--344",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0342",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392263",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Barrekette:1963:DFS,
author = "E. S. Barrekette and H. Freitag",
title = "Diffraction by a Finite Sinusoidal Phase Grating",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "345--349",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0345",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392264",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schay:1963:QPA,
author = "Gaza {Schay, Jr.}",
title = "On a Queueing Problem Arising in Recirculating
Memories",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "350--352",
month = oct,
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0350",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392265",
ZMnumber = "138.11802",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxpages = "350--353",
}
@Article{Freiman:1963:FRP,
author = "C. V. Freiman and R. T. Chien",
title = "Further Results in Polynomial Addressing [Letter to
the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "353--354",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0353",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392266",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ku:1963:ATS,
author = "T. C. Ku",
title = "An Amendment to {``A Theoretical Solution for the
Magnetic Field in the Vicinity of a Recording Head Air
Gap''} [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "355--355",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0355",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392267",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:ITPd,
author = "Anonymous",
title = "{IBM} Technical Papers Published Recently in Other
Journals",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "356--371",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0356",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392268",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:RIPd,
author = "Anonymous",
title = "Recent {IBM} Patents",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "372--373",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0372",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392269",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1963:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "7",
number = "4",
pages = "374--376",
month = "????",
year = "1963",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.74.0374",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:40:04 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392270",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Estes:1964:SSS,
author = "S. E. Estes and H. R. Kerby and H. D. Maxey and R. M.
Walker",
title = "Speech Synthesis from Stored Data",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "2--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801B.pdf",
abstract = "The synthesis of speech by joining together segments
derived from natural speech has not proven to be
satisfactory with segments smaller than words,
especially because of discontinuities in pitch and
formant frequencies at the junctions. It appears that
segmentation of the control signals for an analog
synthesizer may avoid these difficulties. This paper
describes an experimental system to investigate this
method. A library of synthesizer control signals
corresponding to subword segments of speech is now
being developed. The equipment used to generate the
library of control signals, as well as that used to
synthesize connected speech from the library, is
described.\par
The synthesizer is a transistorized terminal analog of
the cascade type. The synthesizer control signals are
originally derived from functions drawn on a
transparent plastic belt with opaque tape and scanned
by a CRT and photomultiplier. The control signal
functions are varied until the speech segment being
studied is satisfactory. The resulting control signals
corresponding to the speech segment are then
automatically digitized and recorded on punched cards
for addition to the library. Connected speech may be
generated by computer assembly of the synthesizer
control signals corresponding to a sequence of speech
segments. In the assembly of connected speech from the
library segments, pitch and timing may be specified
independently of the sequence of segments if desired.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Drangeid:1964:AMF,
author = "K. E. Drangeid and R. Sommerhalder and A.
Segm{\"u}ller and H. Seitz",
title = "Attenuation of a Magnetic Field by a Superconductor",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "13--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801C.pdf",
abstract = "Observation of magnetic ac field penetration through
superconducting tin films has led to the discovery of a
$180^\circ$ phase shift between the magnetic fields on
either side of the film under favorable conditions.
This result has so far been published only in a short
note, and the present paper presents a detailed
description of the experimental technique. A more
quantitative discussion, with emphasis on the physical
aspects of field attenuation in superconductors, will
be published in a future paper.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bonner:1964:SCT,
author = "R. E. Bonner",
title = "On Some Clustering Techniques",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "22--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801D.pdf",
abstract = "The problem of organizing a large mass of data occurs
frequently in research. Normally, some process of
generalization is used to compress the data so that it
can be analyzed more easily. A primitive step in this
process is the ``clustering'' technique, which involves
gathering together similar data into a cluster to
permit a significant generalization.\par
This paper describes a number of methods which make use
of IBM 7090 computer programs to do clustering. A
medical research problem is used to illustrate and
compare these methods.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Critchlow:1964:VSP,
author = "D. L. Critchlow and R. H. Dennard and E. Hopner",
title = "A Vestigial-Sideband, Phase-Reversal Data Transmission
System",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "33--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801E.pdf",
abstract = "A new method of carrier retrieval is described for a
suppressed-carrier, vestigial-sideband data
transmission system. Tests over voice grade telephone
lines indicate that operation at 3000 bits per second
(in some cases, 3600 bps) can be obtained reliably over
private lines with simple adjustable equalization,
whereas fixed compromise equalization will allow speeds
up to 2400 bps over a large percentage of lines in the
switched network. The possibility of higher speed
operation using a multilevel data signal is
demonstrated by tests at 6000 and 8000 bps over a
carefully equalized private line.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pliskin:1964:NDT,
author = "W. A. Pliskin and E. E. Conrad",
title = "Nondestructive Determination of Thickness and
Refractive Index of Transparent Films",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "43--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801F.pdf",
abstract = "A simple nondestructive method of measuring the
refractive index and thickness of transparent films on
reflective substrates has been developed. The technique
involves the use of a microscope equipped with a
monochromatic filter on the objective and a stage that
can be rotated so that the reflected light is observed
at various angles. The film thickness, $d$, is given by
$d=[ \Delta N \lambda]/[2\mu (\cos r_2 - \cos r_1)]$,
where $\lambda$ is the wavelength of the filtered
light, $\mu$ is the refractive index, and $\Delta N$ is
the number of fringes observed between the angles of
refraction $r_2$ and $r_1$.\par
This technique is especially suited for films thicker
than one micron. Techniques are also described for
obtaining accurate thicknesses of films less than one
micron by the combined use of monochromatic filters and
an interference pattern chart. These techniques can be
used to determine film thicknesses ranging from several
hundred angstroms to several microns with accuracies of
0.2\% on films thicker than $2\mu$, and accuracies of
tens of angstroms on thinner films. Since visual
comparisons of color can be used fairly easily for film
thickness determinations, the techniques were used to
construct a color chart for thermally grown SiO$_2$
films up to $1.5\mu$ thick.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bertin:1964:TLR,
author = "C. L. Bertin",
title = "Transmission-Line Response Using Frequency
Techniques",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "52--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801G.pdf",
abstract = "Frequency-domain analysis of transmission-line pulse
response is presented. A computer program is used to
evaluate the response, using subroutines to describe
the line characteristics and terminal conditions. The
program is applicable to lines of any cross section in
which the TEM mode of propagation exists. The line
characteristics are obtained from either formula
prediction or frequency measurements on small samples.
Because of skin effects or complex geometry, these
characteristics can be extremely difficult to
calculate, and so an experimental procedure is adopted
for determining these parameters. The computer-program
results are compared to measured values.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kulcke:1964:FDI,
author = "W. Kulcke and T. J. Harris and K. Kosanke and E. Max",
title = "A Fast, Digital-Indexed Light Deflector",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "64--67",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801H.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wyner:1964:NCB,
author = "A. D. Wyner",
title = "A Note on a Class of Binary Cyclic Codes Which Correct
Solid-Burst Errors",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "68--69",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/081/ibmrd0801I.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RPIa,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "70--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RIPa,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "81--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "8",
number = "1",
pages = "83--??",
month = jan,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Samuel:1964:FIS,
author = "Arthur L. Samuel",
title = "Foreword: The {IBM System\slash 360}",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "86--86",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802B.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Amdahl:1964:AIS,
author = "Gene M. Amdahl and Gerrit A. Blaauw and Frederick P.
{Brooks, Jr.}",
title = "Architecture of the {IBM System\slash 360}",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "87--102",
month = apr,
year = "1964",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.82.0087",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/mathcw.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/50th/architectures/amdahl.html;
http://www.research.ibm.com/journal/rd/082/ibmrd0802C.pdf",
abstract = "The architecture of the newly announced IBM System/360
features four innovations:\par
1. An approach to storage which permits and exploits
very large capacities, hierarchies of speeds, read-only
storage for microprogram control, flexible storage
protection, and simple program relocation.\par
2. An input/output system offering new degrees of
concurrent operation, compatible channel operation,
data rates approaching 5,000,000 characters/second,
integrated design of hardware and software, a new
low-cost, multiple-channel package sharing main-frame
hardware, new provisions for device status information,
and a standard channel interface between central
processing unit and input/output devices.\par
3. A truly general-purpose machine organization
offering new supervisor facilities, powerful logical
processing operations, and a wide variety of data
formats.\par
4. Strict upward and downward machine-language
compatibility over a line of six models having a
performance range factor of 50.\par
This paper discusses in detail the objectives of the
design and the rationale for the main features of the
architecture. Emphasis is given to the problems raised
by the need for compatibility among central processing
units of various size and by the conflicting demands of
commercial, scientific, real-time, and logical
information processing. A tabular summary of the
architecture is shown in the Appendices.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Davis:1964:SLT,
author = "E. M. Davis and W. E. Harding and R. S. Schwartz and
J. J. Corning",
title = "Solid Logic Technology: Versatile, High-Performance
Microelectronics",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "102--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802D.pdf",
abstract = "A new microelectronics packaging technique, called
Solid Logic Technology (SLT), utilizes silicon planar
glass-encapsulated transistors and diodes, and graphic
arts techniques for producing high-quality, passive
components having tight tolerances. The result is a
process permitting the low-cost realization of a
variety of versatile, high-performance circuit
modules.\par
The salient features of SLT are described: the unique
form of the semiconductor devices, the module
fabrication process, and some performance results. In
addition, insight is provided to the range of
components that my be fabricated with this technology,
i.e., inductors, capacitors and high-power transistors.
Examples are shown of specific high-speed, high-density
and complex circuit packages.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Carter:1964:DSF,
author = "W. E. Carter and H. C. Montgomery and R. J. Preiss and
H. J. Reinheimer",
title = "Design of Serviceability Features for the {IBM
System\slash 360}",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "115--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802E.pdf",
abstract = "This paper discusses the design of features that are
intended to provide the IBM System/360 with a
significant improvement in serviceability over that of
previous systems. It was decided from the beginning to
develop the System/360 as an integrated package of
hardware, operational programs, and maintenance
procedures.\par
The major problems to be solved in gaining this
improvement and integration were (a) reducing the
maximum duration of service calls; (b) reducing the
median duration and mean duration of service calls; and
(c) matching a single package of maintenance programs
and procedures to a large variety of operational
monitor programs and machine models.\par
These problems have been attacked by supplementing
standard servicing facilities (both hardware and
program) with (a) the ability to record automatically
the complete, detailed, system environment at the
instant of error discovery; (b) the ability to
initialize the CPU to any arbitrarily specified state
(either ``legal'' or ``illegal''), to advance from this
state by a specified number of machine cycles, and to
compare the new state with a precomputed result state,
much of this using circuits that are independent of
those required for program sequencing; (c) a system of
programs that can be integrated with the System/360
Design Automation to produce automatically the inputs,
results, and location analyses that are required to
exploit the capabilities described in (b); (d) a family
of diagnostic monitor programs that attack directly the
problem of matching maintenance procedures to machine
models and operational monitor programs; and (e) a
facility to retry failing CPU operations at the
instruction level in the larger models, in addition to
the usual retry at the program-segment level.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Case:1964:SLD,
author = "P. W. Case and H. H. Graff and L. E. Griffith and A.
R. LeClercq and W. B. Murley and T. M. Spence",
title = "Solid Logic Design Automation",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "127--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802F.pdf",
abstract = "This paper describes the unique features of a set of
IBM 7090 programs which provide design assistance to
engineers who use Solid Logic Technology. These
programs were applied in the design of the IBM
System/360.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gunn:1964:ICI,
author = "J. B. Gunn",
title = "Instabilities of Current in {III--V} Semiconductors",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "141--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802G.pdf",
abstract = "A description is given of a newly discovered
phenomenon which is observed when an electric field of
a few thousand V cm$^{-1}$ is applied to a homogeneous
sample of $n$-type GaAs or InP. Above a well-defined
threshold field, a time-dependent decrease in current
is observed, which is largely independent of external
circuit conditions. In long specimens this decrease is
aperiodic, resembling random noise with a bandwidth of
$\approx 10^9$ c/sec. In short specimens, coherent
oscillations are observed whose period is equal to the
transit time of electrons between the ohmic electrodes
of the structure. Frequencies over the range of
0.5--6.5 Gc/sec have been generated in this way, using
experimental techniques which are described.
Measurements of the efficiency of dc-to-rf conversion
(from 1 to 2\%), and of peak power outputs (up to 0.5
W), suggest that the new effect may have useful
applications. Some diagnostic experiments are described
and the results are discussed in terms of various
possible mechanisms. Although the quantitative
agreement with theory is poor it is concluded that the
current instability may possibly be due to the
amplification of lattice optical modes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Aaslund:1964:ESD,
author = "N. R. D. {\AA}slund and B. T. Cronhjort",
title = "Evaluation of Spectrochemical Data Using Digital
Techniques",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "160--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802H.pdf",
abstract = "This paper describes how a digital computer was used
in combination with an emission spectrometer to
determine chemical compositions of some steels. A
mathematical model describing the relations between the
composition and the intensities of the spectral lines
was derived and experimentally tested. Both overlapping
and matrix effects were considered. The computer was
also used to calibrate the instrument.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bartkus:1964:ATB,
author = "E. A. Bartkus and J. M. Brownlow and W. A. Crapo and
R. F. Elfant and K. R. Grebe and O. A. Gutwin",
title = "An Approach Towards Batch Fabricated Ferrite Memory
Planes",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "170--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802I.pdf",
abstract = "This paper describes a technique for the batch
fabrication of ferrite memory arrays in which wire,
previously coated with a thermoplastic, is formed into
two orthogonally disposed sets of parallel wires. These
grids are oriented between opposing molds having
matched grooves filled with a fluid mixture of ferrite
powder and thermosetting resin, in such a manner that
one set of parallel wires coincides with the groove
axes. After suitable curing this structure is released
and heat treated to pyrolyze the organic materials and
sinter the ferrite.\par
A yield study on 108 memory arrays produced in this
manner resulted in a yield of 72.2\% on pulse testing
under simulated operating conditions and an over-all
process yield of 36.1\%. The paper concludes with a
tabulation of electrical characteristics of the arrays
and a brief discussion of the applicability of the
technology to various modes of operation and its
potential for high-speed (250 nsec magnetic cycle time)
operation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1964:STA,
author = "P. P. Sorokin and N. Braslau",
title = "Some Theoretical Aspects of a Proposed Double Quantum
Stimulated Emission Device",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "177--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802J.pdf",
abstract = "A double quantum stimulated emission device is
proposed and some operating characteristics and
relevant systems of materials are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1964:RLS,
author = "P. P. Sorokin and J. J. Luzzi and J. R. Lankard and G.
D. Pettit",
title = "Ruby Laser {$Q$}-Switching Elements Using
Phthalocyanine Molecules in Solution",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "182--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802L.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wnuk:1964:CSC,
author = "R. C. Wnuk and T. R. Touw and B. Post",
title = "The Crystal Structure of {CaPd$_3$O$_4$}",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "185--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802L.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Odeh:1964:ETB,
author = "F. M. Odeh",
title = "An Existence Theorem for the {BCS} Integral Equation",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "187--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802M.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Johnson:1964:ORA,
author = "L. R. Johnson and M. H. McAndrew",
title = "On Ordered Retrieval from an Associative Memory",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "189--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/082/ibmrd0802N.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RPIb,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "194--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RIPb,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "208--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "8",
number = "2",
pages = "210--??",
month = apr,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:1964:F,
author = "P. J. Price",
title = "Foreword",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "214--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Pages 215 to 298 of this issue are the Proceedings 01
the conference on The Physics of Semimetals which was
held in Pupin Laboratory, Columbia University on
January 21, 1964.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cohen:1964:CCB,
author = "M. H. Cohen and L. M. Falicov and S. Golin",
title = "Crystal Chemistry and Band Structures of the {Group V}
Semimetals and the {IV--VI} Semiconductors",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "215--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:1964:EFH,
author = "G. E. Smith and G. A. Baraff and J. M. Rowell",
title = "The Effective $g$-factor of Holes in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "228--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vuillemin:1964:HFG,
author = "J. J. Vuillemin",
title = "High Field Galvanomagnetic Effects in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "232--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jain:1964:PRP,
author = "A. L. Jain and R. Jaggi",
title = "Piezo-Resistance and Piezo-Hall Effect in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "233--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yarnell:1964:PDC,
author = "J. L. Yarnell and J. L. Warren and R. G. Wenzel and S.
H. Koenig",
title = "Phonon Dispersion Curves in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "234--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hall:1964:TPB,
author = "J. J. Hall and S. H. Koenig",
title = "Transport Properties and Band Structure in Bismuth,
Antimony and their Alloys",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "241--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Datars:1964:CRF,
author = "W. R. Datars and J. Vanderkooy",
title = "Cyclotron Resonance and the {Fermi} Surface of
Antimony",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "247--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brown:1964:GTP,
author = "D. M. Brown and S. J. Silverman",
title = "Growth and Transport Properties of {Bi--Sb} Single
Crystal Alloys",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "253--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McClure:1964:EBS,
author = "J. W. McClure",
title = "Energy Band Structure of Graphite",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "255--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dresselhaus:1964:FSG,
author = "M. S. Dresselhaus and J. G. Mavroides",
title = "The {Fermi} Surface of Graphite",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "262--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Soule:1964:CFS,
author = "D. E. Soule",
title = "Change in {Fermi} Surfaces of Graphite by Dilute
Acceptor Doping",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "268--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Klein:1964:SMT,
author = "C. A. Klein",
title = "{STB} Model and Transport Properties of Pyrolytic
Graphites",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "274--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Williams:1964:AWP,
author = "G. A. Williams and G. E. Smith",
title = "{Alfv{\'e}n} Wave Propagation in Bismuth: Quantum
Oscillations of the {Fermi} Surface",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "276--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hebel:1964:IRB,
author = "L. C. Hebel",
title = "Infrared Reflectivity of Bismuth in the Quantum
Limit",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "284--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McWhorter:1964:APW,
author = "A. L. McWhorter and W. G. May",
title = "Acoustic Plasma Waves in Semimetals",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "285--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tosima:1964:ESM,
author = "S. Tosima and R. Hirota",
title = "Effect of the Self-Magnetic Field on Galvanomagnetic
Effects in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "291--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schillinger:1964:NOC,
author = "W. Schillinger",
title = "Non-Ohmic Conduction in Bismuth",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "295--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greenberg:1964:LNM,
author = "H. J. Greenberg and Allan G. Konheim",
title = "Linear and nonlinear methods in pattern
classification",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "299--307",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "199.22401",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Newman:1964:MCV,
author = "E. G. Newman and L. F. Winter",
title = "Magnetically Controlled Variable Logic",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "308--317",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "131.15602",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anello:1964:NDM,
author = "A. J. Anello and A. C. Ruocchio and W. D. {VanGieson,
Jr.}",
title = "A New Digital Method of Bit Synchronization Derived
from an Analog Theory",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "318--328",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "137.34303",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxauthor = "A. J. Anello and A. C. Ruocchio and W. D. {Gieson,
Jr.}",
}
@Article{Mitchell:1964:SHA,
author = "A. H. Mitchell and K. L. Johnson",
title = "Simulation of a Hydraulic Actuator",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "329--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fan:1964:NRM,
author = "G. J. Y. Fan",
title = "A Note on the Resonant Modes and Spatial Coherency of
a {Fabry--Perot} Maser Interferometer",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "335--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Garwin:1964:ANT,
author = "R. L. Garwin",
title = "Analysis of a Nondegenerate Two-Photon Giant-Pulse
Laser",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "338--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RPIc,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "341--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RIPc,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "360--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "8",
number = "3",
pages = "361--??",
month = jul,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Young:1964:SES,
author = "D. R. Young and D. P. Seraphim",
title = "Surface Effects on Silicon: Introduction",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "366--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Thomas:1964:SCM,
author = "J. E. {Thomas, Jr.} and D. R. Young",
title = "Space-Charge Model for Surface Potential Shifts in
Silicon Passivated with Thin Insulating Layers",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "368--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kerr:1964:SSP,
author = "D. R. Kerr and J. S. Logan and P. J. Burkhardt and W.
A. Pliskin",
title = "Stabilization of {SiO$_2$} Passivation Layers with
{P$_2$O$_5$}",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "376--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kerr:1964:ETB,
author = "D. R. Kerr",
title = "Effect of Temperature and Bias on Glass--Silicon
Interfaces",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "385--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Castrucci:1964:ECS,
author = "P. P. Castrucci and J. S. Logan",
title = "Electrode Control of {SiO$_2$} Passivated Planar
Junctions",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "394--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seraphim:1964:EPT,
author = "D. P. Seraphim and A. E. Brennemann and F. M. d'Heurle
and H. L. Friedman",
title = "Electrochemical Phenomena in Thin Films of Silicon
Dioxide on Silicon",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "400--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fang:1964:CSS,
author = "F. Fang and S. Triebwasser",
title = "Carrier Surface Scattering in Silicon Inversion
Layers",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "410--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cheroff:1964:ELT,
author = "G. Cheroff and F. Fang and F. Hochberg",
title = "Effect of Low Temperature Annealing on the Surface
Conductivity of {Si} in the {Si--SiO$_2$--Al} System",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "416--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lehman:1964:CAE,
author = "H. S. Lehman",
title = "Chemical and Ambient Effects on Surface Conduction in
Passivated Silicon Semiconductors",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "422--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fowler:1964:HMS,
author = "A. B. Fowler and F. Fang and F. Hochberg",
title = "{Hall} Measurements on Silicon Field Effect Transistor
Structures",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "427--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Adler:1964:VSM,
author = "E. Adler",
title = "Velocity of Sound in a Many-Valley Conductor",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "430--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:1964:DDT,
author = "W. T. Chen",
title = "Displacement Discontinuity over a Transversely
Isotropic Elastic Half-Space",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "435--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Taub:1964:DTD,
author = "D. M. Taub and B. W. Kington",
title = "The Design of Transformer (Diamond Ring) Read-Only
Stores",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "443--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lever:1964:EBS,
author = "R. F. Lever",
title = "The Equilibrium Behavior of the
Silicon--Hydrogen--Chlorine System",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "460--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brayton:1964:SCL,
author = "R. K. Brayton",
title = "Stability Criteria for Large Networks",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "466--470",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "222.94027",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lasher:1964:MQI,
author = "G. J. Lasher and A. B. Fowler",
title = "Mutually Quenched Injection Lasers as Bistable
Devices",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "471--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RIPd,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "476--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "8",
number = "4",
pages = "??--??",
month = sep,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1964:SAD,
author = "D. P. Kennedy and P. C. Murley and R. R. O'Brien",
title = "A Statistical Approach to the Design of Diffused
Junction Transistors",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "482--495",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/085/ibmrd0805B.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marcus:1964:CCS,
author = "P. M. Marcus",
title = "Calculation of the Capacitance of a Semiconductor
Surface, with Application to Silicon",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "496--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Murphy:1964:DAT,
author = "D. W. Murphy and J. R. Turnbull",
title = "Design of {ACP} Tunnel-Diode-Coupled Circuits",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "506--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Swalen:1964:CAE,
author = "J. D. Swalen and H. M. Gladney",
title = "Computer Analysis of Electron Paramagnetic Resonance
Spectra",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "515--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Im:1964:GPG,
author = "S. S. Im and J. H. Butler and D. A. Chance",
title = "Glass-Passivated {GaAs} Chip Tunnel Diode",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "527--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lasher:1964:TLE,
author = "G. J. Lasher and W. V. Smith",
title = "Thermal Limitations on the Energy of a Single
Injection Laser Light Pulse",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "532--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marcus:1964:DMC,
author = "M. P. Marcus",
title = "Derivation of Maximal Compatibles Using {Boolean}
Algebra",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "537--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rutz:1964:NRT,
author = "R. F. Rutz",
title = "Negative Resistance Tunnel Diodes in Silicon Carbide",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "539--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marinace:1964:HPC,
author = "J. C. Marinace",
title = "High Power {CW} Operation of {GaAs} Injection Lasers
at {77K}",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "543--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Braslau:1964:CMO,
author = "N. Braslau and J. B. Gunn and J. L. Staples",
title = "Continuous Microwave Oscillations of Current in
{GaAs}",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "545--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RPId,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "547--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:RIPe,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "563--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1964:Ae,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "8",
number = "5",
pages = "566--??",
month = nov,
year = "1964",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Clementi:1965:AIC,
author = "E. Clementi",
title = "Ab Initio Computations in Atoms and Molecules",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "2--19",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 09 09:41:45 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See supplemental volume \cite{Clementi:1965:TAF}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schreiner:1965:ADC,
author = "K. E. Schreiner and H. L. Funk and E. Hopner",
title = "Automatic Distortion Correction for Efficient Pulse
Transmission",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "20--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hardy:1965:AIF,
author = "W. A. Hardy",
title = "Active Image Formation in Lasers",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "31--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Elgot:1965:RDG,
author = "C. C. Elgot and J. E. Mezei",
title = "On relations defined by generalized finite automata",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "47--68",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.40",
MRnumber = "35 \#7732",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "135.00704",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "H. D. Modrow",
}
@Article{Price:1965:ASH,
author = "P. J. Price",
title = "Amplification of Sound by Hot Electrons",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "69--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RPIe,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "71--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RIPf,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "85--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:Af,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "9",
number = "1",
pages = "87--??",
month = jan,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eichelberger:1965:HDC,
author = "E. B. Eichelberger",
title = "Hazard Detection in Combinational and Sequential
Switching Circuits",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "90--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zweig:1965:CCM,
author = "H. J. Zweig and D. P. Gaver",
title = "Coincidence Counter Models with Applications to
Photographic Detection Theory",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "100--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Barrekette:1965:PBG,
author = "E. S. Barrekette and R. L. Christensen",
title = "On Plane Blazed Gratings",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "108--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kump:1965:DFU,
author = "H. J. Kump",
title = "Demagnetization of Flat Uniaxial Thin Films Under Hard
Direction Drive",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "118--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hertrich:1965:AMT,
author = "F. R. Hertrich",
title = "Average Motion Times of Positioners in Random Access
Devices",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "124--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fields:1965:STS,
author = "D. S. {Fields, Jr.}",
title = "Sheet Thermoforming of a Superplastic Alloy",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "134--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Thrasher:1965:NMF,
author = "P. M. Thrasher",
title = "A New Method for Frequency-Division Multiplexing, and
Its Integration with Time-Division Switching",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "137--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{LeMehaute:1965:ESI,
author = "C. LeM{\'e}haut{\'e} and E. Rocher",
title = "Electrodeposition of Stress-Insensitive {Ni--Fe} and
{Ni--Fe--Cu} Magnetic Alloys",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "141--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Middelhoek:1965:PDB,
author = "S. Middelhoek",
title = "Peculiar Domain Behavior in Thin, Magnetic {Ni--Fe}
Double Films",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "147--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RPIf,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "150--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RIPg,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "163--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:Ag,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "9",
number = "2",
pages = "165--??",
month = mar,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Armstrong:1965:FHT,
author = "J. A. Armstrong",
title = "{Fresnel} Holograms: Their Imaging Properties and
Aberrations",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "171--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/093/ibmrd0903B.pdf",
abstract = "A simple and unified treatment is given of the
properties of the magnified or demagnified images
reconstructed from Fresnel holograms. The resolution
attainable in wavefront reconstruction is discussed
with particular attention to the aberrations of
reconstructed images. Explicit expressions are given
for the five primary wave aberrations, viz., spherical
aberration, coma, astigmatism, curvature of field, and
distortion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1965:AIA,
author = "D. P. Kennedy and R. R. O'Brien",
title = "Analysis of the Impurity Atom Distribution Near the
Diffusion Mask for a Planar $p$--$n$ Junction",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "179--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Luttmann:1965:SNE,
author = "F. W. Luttmann and T. J. Rivlin",
title = "Some Numerical Experiments in the Theory of Polynomial
Interpolation",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "187--191",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.20",
MRnumber = "31 \#4147",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:1965:CCT,
author = "W. T. Chen and R. P. Soni",
title = "On a Circular Crack in a Transversely Isotropic
Elastic Material Under Prescribed Shear Stress",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "192--195",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "73.99",
MRnumber = "31 \#6426",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. D. Kroll",
}
@Article{Flatt:1965:CMC,
author = "H. P. Flatt",
title = "Chain Matrices and the {Crank--Nicolson} Equation",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "196--199",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.68",
MRnumber = "31 \#4191",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "K. Rektorys",
}
@Article{Polgar:1965:DSG,
author = "P. Polgar and M. M. Roy and T.-H. Yeh",
title = "A Drive Scheme for the {GaAs--Si} Light-Activated
Switch",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "200--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McLean:1965:MAR,
author = "A. D. McLean and M. Yoshimine",
title = "Mapping an arbitrary range into $(-1,\,1)$ with a side
condition: {Application} to numerical quadratures",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "203--204",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.55",
MRnumber = "32 \#6672",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/093/ibmrd0903H.pdf",
abstract = "The mapping used is $x = c_1 + c_2(1 + \beta)/(1 -
\beta t)$, where points $x$ in the range $(a,b)$ map
onto points in the range $(-1,\,1)$ subject to the
constraints that $a \rightarrow -1$, $b \rightarrow 1$,
and $m \rightarrow 0$. The value $m$ is an arbitrary
point in the range $(a,b)$.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Gauss--Legendre integration",
reviewer = "P. J. Davis",
}
@Article{Peterson:1965:NTD,
author = "R. H. Peterson and R. L. Hoffman",
title = "A New Technique for Dynamic Analysis of Acoustical
Noise",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "205--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RPIg,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "209--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RIPh,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "219--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:Ah,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "9",
number = "3",
pages = "221--??",
month = may,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andrews:1965:CDP,
author = "M. C. Andrews",
title = "On Communications and Data Processing: a Foreword",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "226--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gorog:1965:NAT,
author = "E. Gorog",
title = "A New Approach to Time-Domain Equalization",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "228--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ullman:1965:DCC,
author = "J. D. Ullman",
title = "Decoding of Cyclic Codes Using Position Invariant
Functions",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "233--240",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "31 \#4651",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "202.50501",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Blasbalg:1965:CPN,
author = "H. Blasbalg",
title = "A Comparison of Pseudo-Noise and Conventional
Modulation for Multiple-Access Satellite
Communications",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "241--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Corr:1965:PPN,
author = "F. Corr and R. Crutchfield and J. Marchese",
title = "A Pulsed Pseudo-Noise {VHF} Radio Set",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "256--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{VanBlerkom:1965:ASD,
author = "R. VanBlerkom and R. E. Sears and D. G. Freeman",
title = "Analysis and Simulation of a Digital Matched Filter
Receiver of Pseudo-Noise Signals",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "264--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abbott:1965:DAT,
author = "G. F. Abbott and R. L. Bence and J. A. Ceonzo and J.
M. Regan",
title = "Design of an Automatic Telephone Intercept Switch",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "274--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roehr:1965:FPI,
author = "K. M. Roehr and P. M. Thrasher and D. J. {McAuliffe,
Jr.}",
title = "Filter Performance in Integrated Switching and
Multiplexing",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "282--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chien:1965:DB,
author = "R. T. Chien and D. T. Tang",
title = "On Definitions of a Burst",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "292--293",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "31 \#5726",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. W. Peterson",
}
@Article{Mattson:1965:TDC,
author = "R. L. Mattson and J. E. Dammann",
title = "A Technique for Determining and Coding Subclasses in
Pattern Recognition Problems",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "294--302",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00",
MRnumber = "31 \#4647",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Keyes:1965:TPI,
author = "R. W. Keyes",
title = "Thermal Problems of the Injection Laser",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "303--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Weiser:1965:PGD,
author = "K. Weiser",
title = "Properties of {GaAs} Diodes with {P--P$^0$--N}
Structures",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "315--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gregor:1965:VPP,
author = "L. V. Gregor and P. Balk and F. J. Campagna",
title = "Vapor-Phase Polishing of Silicon with {H$_2$--HBr} Gas
Mixtures",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "327--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zweig:1965:TDL,
author = "H. J. Zweig",
title = "Two-Dimensional Laser Deflection Using {Fourier}
Optics",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "333--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kehr:1965:FSC,
author = "W. D. Kehr",
title = "Fatigue Strength of Case Hardened Steel Specimens
Containing Through-The-Case Cracks",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "336--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RPIh,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "339--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RIPi,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "351--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:Ai,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "9",
number = "4",
pages = "353--??",
month = jul,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nowick:1965:HSM,
author = "A. S. Nowick and S. R. Mader",
title = "A Hard-Sphere Model to Simulate Alloy Thin Films",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "358--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/095/ibmrd0905a6B.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jona:1965:OCS,
author = "F. Jona",
title = "Observations of ``Clean'' Surfaces of {Si}, {Ge}, and
{GaAs} by Low-Energy Electron Diffraction",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "375--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Davidson:1965:SCC,
author = "B. Davidson and M. J. Shah",
title = "Simulation of the Catalytic Cracking Process for
Styrene Production",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "388--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pilkuhn:1965:JHG,
author = "M. H. Pilkuhn and H. S. Rupprecht",
title = "Junction Heating of {GaAs} Injection Lasers During
Continuous Operation",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "400--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cooley:1965:SEW,
author = "J. W. Cooley and F. Stern",
title = "Solution of the Equation for Wave Propagation in
Layered Slabs with Complex Dielectric Constants",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "405--411",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.62",
MRnumber = "32 \#1890",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "248.65052",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sagnis:1965:CMM,
author = "J. C. {Sagnis, Jr.} and P. E. Stuckert and R. L.
Ward",
title = "The Chain Magnetic Memory Element",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "412--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Voit:1965:DPL,
author = "W. F. {Voit, Jr.}",
title = "Digital Pneumatic Logic Using Coded Tapes",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "418--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1965:ECI,
author = "D. P. Kennedy and R. R. O'Brien",
title = "The Effective Carrier Ionization Rate in a $p$--$n$
Junction at Avalanche Breakdown",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "422--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RPIi,
author = "Anonymous",
title = "Recent Papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "424--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:RIPj,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "436--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1965:Aj,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "9",
number = "5/6",
pages = "438--??",
month = sep # "\slash " # nov,
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 30 08:50:43 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Clementi:1965:TAF,
author = "Enrico Clementi",
title = "Tables of Atomic Functions",
journal = j-IBM-JRD,
volume = "9",
number = "Supplement",
pages = "(various)",
year = "1965",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 09 13:48:54 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "This volume is a supplement to
\cite{Clementi:1965:AIC}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Herrick:1966:SPD,
author = "C. E. Herrick",
title = "Solution of the Partial Differential Equations
Describing Photodecomposition in a Light-absorbing
Matrix having Light-absorbing Photoproducts",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "2--5",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392099",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1966:CIA,
author = "D. P. Kennedy and P. C. Murley",
title = "Calculations of Impurity Atom Diffusion Through a
Narrow Diffusion Mask Opening",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "6--12",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0006",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392100",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rutz-Philipp:1966:DTH,
author = "E. M. Rutz-Philipp",
title = "Design Technique for High-Efficiency Frequency
Doublers Based on the Manley and Rowe Energy
Relations",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "13--25",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0013",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392101",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lever:1966:CIT,
author = "R. F. Lever",
title = "Computation of Ion Trajectories in the Monopole Mass
Spectrometer by Numerical Integration of {Mathieu}'s
Equation",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "26--40",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0026",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392102",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anacker:1966:DPS,
author = "W. Anacker and G. F. Bland and P. Pleshko and P. E.
Stuckert",
title = "On the Design and Performance of a Small 60-nsec
Destructive Readout Magnetic Film Memory",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "41--50",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0041",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392103",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Giacoletto:1966:MLP,
author = "L. J. Giacoletto",
title = "On Measures of Logic Performance: Logic Quantum,
Factor, and Figure of Merit",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "51--64",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0051",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392104",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{King:1966:SES,
author = "J. H. King and C. J. Tunis",
title = "Some Experiments in Spoken Word Recognition",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "65--79",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0065",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392105",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dammann:1966:ECD,
author = "J. E. Dammann",
title = "An Experiment in Cluster Detection [Letter to the
Editor]",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "80--88",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0080",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392106",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kump:1966:DLM,
author = "H. J. Kump and H. G. Hottenrott and B. I. Bertelsen
and P. T. Chang",
title = "The Dispersion Locked Memory Mode for Magnetic Films",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "89--94",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0089",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392107",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reid:1966:DTR,
author = "F. A. Reid",
title = "Dynamic Thermal Response and Voltage Feedback in
Junction Transistors",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "95--97",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0095",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392108",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Langlois:1966:CTM,
author = "W. E. Langlois",
title = "Conditions for termination of the method of steepest
descent after a finite number of iterations",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "98--99",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0098",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.10",
MRnumber = "32 \#6642",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392109",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. C. Rheinboldt",
}
@Article{Anonymous:1966:TPIa,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "100--107",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0100",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392110",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPa,
author = "Anonymous",
title = "Recent Issued Patents Assigned To {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "108--109",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0108",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392111",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "110--112",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.101.0110",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392112",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:CPTa,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "112--112",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392113",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392113",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:ECP,
author = "Anonymous",
title = "Errata [{A} Comparison of Pseudo-Noise and
Conventional Modulation for Multiple-Access Satellite
Communications, by {H}. Blasbalg]",
journal = j-IBM-JRD,
volume = "10",
number = "1",
pages = "112--112",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392114",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:31 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392114",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Foster:1966:FBL,
author = "L. M. Foster and T. S. Plaskett and J. E.
Scardefield",
title = "Formation of Built-in Light-emitting Junctions in
Solution-grown {GaP} Containing Shallow Donors and
Acceptors",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "114--121",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0114",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392059",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pilkuhn:1966:GLS,
author = "M. H. Pilkuhn and L. M. Foster",
title = "{Green} Luminescence from Solution-grown Junctions in
{GaP} Containing Shallow Donors and Acceptors",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "122--129",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0122",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392060",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ravi:1966:EKT,
author = "C. G. Ravi and G. G. Koerber",
title = "Effects of a Keeper on Thin Film Magnetic Bits",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "130--134",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392061",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kirkpatrick:1966:PAL,
author = "T. I. Kirkpatrick and N. R. Clark",
title = "{Pert} as an Aid to Logic Design",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "135--141",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0135",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392062",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haskell:1966:DPC,
author = "J. W. Haskell",
title = "Design of a Printed Card Capacitor Read-Only Store",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "142--157",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0142",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392063",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rogers:1966:PCP,
author = "W. F. Rogers",
title = "A Practical Class of Polynomial Codes",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "158--161",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0158",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392064",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1966:SEO,
author = "P. P. Sorokin and J. R. Lankard",
title = "Stimulated Emission Observed from an Organic Dye,
Chloro-aluminum Phthalocyanine",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "162--163",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0162",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392065",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:TPIb,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "164--180",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0164",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392066",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPb,
author = "Anonymous",
title = "Recent {IBM} Patents Assigned to {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "181--182",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0181",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392067",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "2",
pages = "183--184",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.102.0183",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:33 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392068",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hasty:1966:ASP,
author = "C. E. Hasty and J. F. Potts",
title = "Analysis and Synthesis Procedures for {Geneva}
Mechanism Design",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "186--197",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0186",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392070",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pliskin:1966:SLP,
author = "W. A. Pliskin",
title = "Separation of the Linear and Parabolic Terms in the
Steam Oxidation of Silicon",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "198--206",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0198",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392071",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ho:1966:TAS,
author = "C. Y. Ho",
title = "Tensor Analysis of Spatial Mechanisms",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "207--212",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0207",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392072",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1966:ABC,
author = "D. P. Kennedy and R. R. O'Brien",
title = "Avalanche Breakdown Calculations for a Planar $p$-n
Junction",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "213--219",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0213",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392073",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Czaykowski:1966:SFT,
author = "G. T. Czaykowski and I. G. Tadjbakhsh and Yih-O. Tu",
title = "Stability of Flexible Tapes in Parallel Flow",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "220--224",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0220",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392074",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:1966:INM,
author = "A. W. Smith and J. A. Armstrong",
title = "Intensity Noise in Multimode {GaAs} Laser Emission",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "225--232",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0225",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392075",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Speliotis:1966:TAS,
author = "D. E. Speliotis and J. R. Morrison",
title = "A Theoretical Analysis of Saturation Magnetic
Recording",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "233--243",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0233",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392076",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Knauft:1966:SNM,
author = "G. Knauft and H. Lamparter and W. G. Spruth",
title = "Some New Methods for Digital Encoding of Voice Signals
and for Voice Code Translation",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "244--254",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0244",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392077",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kump:1966:TRP,
author = "H. J. Kump and P. T. Chang",
title = "Thermostrictive Recording on Permalloy Films",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "255--260",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0255",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392078",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:TPP,
author = "Anonymous",
title = "Technical Published Papers by {IBM} Authors Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "261--271",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0261",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392079",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPc,
author = "Anonymous",
title = "Recent Issued Patents Assigned to {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "272--273",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0272",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392080",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "274--275",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.103.0274",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392081",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:CPTb,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "276--276",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392082",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392082",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:EA,
author = "Anonymous",
title = "Errata [Addendum]",
journal = j-IBM-JRD,
volume = "10",
number = "3",
pages = "276--276",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392083",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:35 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392083",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roth:1966:DAF,
author = "J. Paul Roth",
title = "Diagnosis of Automata Failures: a Calculus and a
Method",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "278--291",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.40",
MRnumber = "37 \#7221",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392030",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brayton:1966:NAT,
author = "R. K. Brayton and F. G. Gustavson and W. Liniger",
title = "A numerical analysis of the transient behavior of a
transistor circuit",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "292--299",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0292",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392031",
ZMnumber = "203.15302",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gunn:1966:PFS,
author = "J. B. Gunn",
title = "Properties of a Free, Steadily Travelling Electrical
Domain in {GaAs}",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "300--309",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0300",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392032",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gunn:1966:EDC,
author = "J. B. Gunn",
title = "Effect of Domain and Circuit Properties on
Oscillations in {GaAs}",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "310--320",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0310",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392033",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Preisinger:1966:REM,
author = "M. Preisinger",
title = "Resonant Excitation of Magnetostrictive Driven Print
Wires for High-Speed Printing",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "321--332",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0321",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392034",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Matick:1966:HSR,
author = "R. E. Matick and P. Pleshko and C. Sie and L. M.
Terman",
title = "A High-Speed Read Only Store Using Thick Magnetic
Films",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "333--342",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0333",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392035",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Johnson:1966:LFP,
author = "C. Johnson and R. C. Turnbull",
title = "Localized-Field Permanent Magnet Array for the
Thick-Film Read Only Store",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "343--345",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0343",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392036",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Habegger:1966:DLW,
author = "M. A. Habegger and T. J. Harris and E. Max",
title = "Dynamic Laser Wavelength Selection",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "346--350",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0346",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392037",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Middelhoek:1966:DWV,
author = "S. Middelhoek",
title = "Domain Wall Velocities in Thin Magnetic Films",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "351--354",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0351",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392038",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:TPIc,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "355--363",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0355",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392039",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPd,
author = "Anonymous",
title = "Recent Issued Patents Assigned to {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "364--365",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0364",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392040",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "366--367",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.104.0366",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392041",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:CPTc,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "368--368",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392042",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392042",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:EE,
author = "Anonymous",
title = "Errata [Erratum]",
journal = j-IBM-JRD,
volume = "10",
number = "4",
pages = "368--368",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1966.5392043",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:37 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392043",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bilous:1966:DMC,
author = "O. Bilous and I. Feinberg and J. L. Langdon",
title = "Design of Monolithic Circuit Chips",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "370--376",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0370",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392045",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Slonczewski:1966:TDW,
author = "J. C. Slonczewski",
title = "Theory of Domain-Wall Structure in Multiple Magnetic
Films",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "377--387",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392046",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rosenberg:1966:MHF,
author = "A. L. Rosenberg",
title = "On Multi-Head Finite Automata",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "388--394",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0388",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.40",
MRnumber = "34 \#2371",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392047",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "E. Shamir",
}
@Article{Price:1966:QME,
author = "P. J. Price",
title = "The quantum mechanical extension of the {Boltzmann}
equation",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "395--400",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0395",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392048",
ZMnumber = "148.24004",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1966:EPS,
author = "P. P. Sorokin and W. H. Culver and E. C. Hammond and
J. R. Lankard",
title = "End-Pumped Stimulated Emission from a Thiacarbocyanine
Dye",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "401--401",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0401",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392049",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roberts:1966:KTT,
author = "S. M. Roberts and J. S. Shipman",
title = "The {Kantorovich} theorem and two-point boundary value
problems",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "402--406",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0402",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.62",
MRnumber = "34 \#2198",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392050",
ZMnumber = "196.49704",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "G. N. Lance",
}
@Article{Paris:1966:DSI,
author = "D. P. Paris",
title = "Digital Simulation of Image-Forming Systems",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "407--411",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0407",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392051",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abbott:1966:DMA,
author = "T. D. Abbott",
title = "Design of a {Moir{\'e}} Fringe Torque Transducer",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "412--415",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0412",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392052",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roehr:1966:INI,
author = "K. M. Roehr",
title = "Influence of Non-ideal Filters on the Transmission
Characteristics of Resonant Transfer Switching
Systems",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "416--419",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0416",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392053",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kehr:1966:SAC,
author = "W. D. Kehr and H. E. Seese",
title = "Surface Attack in Chromium-Iron Alloys",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "420--421",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0420",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392054",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:TPId,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "422--431",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0422",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392055",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPe,
author = "Anonymous",
title = "Recent Issued Patents Assigned to {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "432--434",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0432",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392056",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Ae,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "5",
pages = "435--436",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.105.0435",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:39 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392057",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{vonMunch:1966:GAP,
author = "W. von Munch",
title = "Gallium Arsenide Planar Technology",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "438--445",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0438",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392003",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Joshi:1966:DID,
author = "M. L. Joshi and S. Dash",
title = "Dislocation-Induced Deviation of Phosphorus-Diffusion
Profiles in Silicon",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "446--454",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0446",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392004",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rothauser:1966:IVA,
author = "E. H. Rothauser",
title = "The Integrated Vocoder and its Application in Computer
Systems",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "455--461",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0455",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392005",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brown:1966:NMH,
author = "Rodney D. Brown",
title = "New Methods for De Haas-Shubnikov Measurements",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "462--471",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0462",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392006",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Daniel:1966:PEA,
author = "James W. Daniel",
title = "A partial error analysis for the solution of
differential equations in simulation: a look at
{Fowler}'s $z$-transform root-locus method",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "472--476",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0472",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392007",
ZMnumber = "208.43303",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ahn:1966:SMM,
author = "K. Y. Ahn",
title = "In-situ Measurements of Magnetic Properties in
Vacuum-Deposited Permalloy Films",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "477--483",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0477",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392008",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chang:1966:EBA,
author = "L. L. Chang and P. J. Stiles and L. Esaki",
title = "Electron Barriers in {Al-Al$_2$O$_3$-SnTe} and
{Al-Al$_2$O$_3$-GeTe} Tunnel Junctions",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "484--486",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0484",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392009",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:TPIe,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "487--497",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0487",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392010",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:RIPf,
author = "Anonymous",
title = "Recent Issued Patents Assigned to {IBM}",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "498--499",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0498",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392011",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1966:Af,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "10",
number = "6",
pages = "500--500",
month = "????",
year = "1966",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.106.0500",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:13:41 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392012",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Flynn:1967:ISM,
author = "M. J. Flynn and P. R. Low",
title = "The {IBM {System\slash} 360} Model 91: Some Remarks on
System Development",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "2--7",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392014",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McLean:1967:TLM,
author = "A. D. McLean and M. Yoshimine",
title = "Tables of Linear Molecule Wavefunctions",
journal = j-IBM-JRD,
volume = "11",
number = "11",
pages = "8 + 223",
month = nov,
year = "1967",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 09 13:48:49 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "This volume is a supplement to
\cite{McLean:1967:CMP}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1967:ISMa,
author = "D. W. Anderson and F. J. Sparacio and R. M. Tomasulo",
title = "The {IBM System\slash 360 Model 91}: Machine
Philosophy and Instruction Handling",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "8--24",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0008",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392015",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tomasulo:1967:EAE,
author = "R. M. Tomasulo",
title = "An Efficient Algorithm for Exploiting Multiple
Arithmetic Units",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "25--33",
month = jan,
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0025",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392028",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1967:ISMb,
author = "S. F. Anderson and J. G. Earle and R. E. Goldschmidt
and D. M. Powers",
title = "The {IBM System\slash 360 Model 91}: Floating-point
execution unit",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "34--53",
month = jan,
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0034",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "http://www.research.ibm.com/journal/;
https://www.math.utah.edu/pub/bibnet/authors/w/wilkes-maurice-v.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392016",
abstract = "The principal requirement for the Model 91
floating-point execution unit was that it be designed
to support the instruction-issuing rate of the
processor. The chosen solution was to develop separate,
instruction-oriented algorithms for the add, multiply,
and divide functions. Linked together by the
floating-point instruction unit, the multiple execution
units provide concurrent instruction execution at the
burst rate of one instruction per cycle.",
acknowledgement = ack-nhfb # "\slash " # ack-nj,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
remark = "This is the first paper in this journal (based on a
full-text search in the IEEE Xplore database) to cite
Maurice Wilkes. In the context of a quadratically
convergent divide algorithm, it refers to
\cite{Wilkes:1951:PPE}.",
}
@Article{Boland:1967:ISM,
author = "L. J. Boland and G. D. Granito and A. U. Marcotte and
B. U. Messina and J. W. Smith",
title = "The {IBM {System\slash} 360} Model 91: Storage
System",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "54--68",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0054",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392017",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Langdon:1967:DHS,
author = "J. Langdon and E. J. {Van Derveer}",
title = "Design of a High-Speed Transistor for the {ASLT}
Current Switch",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "69--73",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0069",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392018",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sechler:1967:ACD,
author = "R. F. Sechler and A. R. Strube and J. R. Turnbull",
title = "{ASLT} Circuit Design",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "74--85",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0074",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392019",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lloyd:1967:AEH,
author = "R. H. F. Lloyd",
title = "{ASLT}: An Extension of Hybrid Miniaturization
Techniques",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "86--92",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0086",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392020",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Middelhoek:1967:RWC,
author = "S. Middelhoek and D. Wild",
title = "Review of Wall Creeping in Thin Magnetic Films",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "93--105",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0093",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392021",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mehta:1967:RMD,
author = "P. K. Mehta and M. J. Shah",
title = "A Rapid Method for Determining Compound Composition of
Cement Clinker: Application to Closed Loop Kiln
Control",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "106--113",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0106",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392022",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schneider:1967:NED,
author = "Peter R. Schneider",
title = "On the Necessity to Examine {D}-Chains in Diagnostic
Test Generation --- An Example [Letter to the Editor]",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "114--114",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0114",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392023",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPIa,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "115--121",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0115",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392024",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRIa,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "122--124",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0122",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392025",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Aa,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "125--127",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.111.0125",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392026",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPTa,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "11",
number = "1",
pages = "128--129",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5392027",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:09 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392027",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1967:LPS,
author = "P. P. Sorokin and J. R. Lankard and E. C. Hammond and
V. L. Moruzzi",
title = "Laser-pumped Stimulated Emission from Organic Dyes:
Experimental Studies and Analytical Comparisons",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "130--148",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0130",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391973",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:1967:FEO,
author = "P. P. Sorokin and J. R. Lankard",
title = "Flashlamp Excitation of Organic Dye Lasers: a Short
Communication",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "148--148",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0148",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391974",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Werner:1967:NFC,
author = "G. E. Werner and R. M. Whalen and N. F. Lockhart and
R. C. Flaker",
title = "A 110-Nanosecond Ferrite Core Memory",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "153--161",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0153",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391975",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kohn:1967:VHS,
author = "G. Kohn and W. Jutzi and Th. Mohr and D. Seitzer",
title = "A Very-High-Speed, Nondestructive-Read Magnetic Film
Memory",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "162--168",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0162",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391976",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pugh:1967:DAD,
author = "E. W. Pugh and V. T. Shahan and W. T. Siegle",
title = "Device and Array Design for a 120-Nanosecond Magnetic
Film Main Memory",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "169--178",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0169",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391977",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fredriksen:1967:DDP,
author = "T. R. Fredriksen",
title = "Direct Digital Processor Control of Stepping Motors",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "179--188",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0179",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391978",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Edwards:1967:DSA,
author = "R. B. Edwards and D. T. Hodges and W. D. Hopkins and
D. P. Paris",
title = "Digital Simulation Applied to a Photo-Optical System",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "189--194",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0189",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391979",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPIb,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "195--207",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0195",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391980",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRIb,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "208--209",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0208",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391981",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Ab,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "210--212",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0210",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391982",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:SSD,
author = "Anonymous",
title = "Special Section on Difference Equations [Foreword]",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "213--213",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0213",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391983",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:APD,
author = "Anonymous",
title = "Authors of the Paprs on Difference Equations",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "214--214",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5391984",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391984",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Courant:1967:PDE,
author = "R. Courant and K. Friedrichs and H. Lewy",
title = "On the partial difference equations of mathematical
physics",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "215--234",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0215",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "39.20 (69.00)",
MRnumber = "35 \#4621",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391985",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lax:1967:HDE,
author = "Peter D. Lax",
title = "Hyperbolic difference equations: a review of the
{Courant-Friedrichs-Lewy} paper in the light of recent
developments",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "235--238",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0235",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.67",
MRnumber = "36 \#2330",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391986",
ZMnumber = "233.65051",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "P. Laasonen",
}
@Article{Widlund:1967:DMP,
author = "O. B. Widlund",
title = "On difference methods for parabolic equations and
alternating direction implicit methods for elliptic
equations",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "239--243",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0239",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.68",
MRnumber = "36 \#7356",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391987",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. H. Bramble",
}
@Article{Parter:1967:EE,
author = "S. V. Parter",
title = "Elliptic Equations",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "244--247",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.112.0244",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.66",
MRnumber = "37 \#1097",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391988",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPTb,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "11",
number = "2",
pages = "248--249",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5391989",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:11 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391989",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:1967:MTL,
author = "D. P. Kennedy and R. R. O'Brien",
title = "On the Mathematical Theory of the Linearly-Graded
{P}-{N} Junction",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "252--270",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0252",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391991",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Joshi:1967:PPA,
author = "M. L. Joshi and S. Dash",
title = "Precipitation of Phosphorus, Arsenic, and Boron in
Thin Silicon Foils",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "271--283",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0271",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391992",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Palmer:1967:VDW,
author = "W. Palmer and R. A. Willoughby",
title = "On the Velocity of a Domain Wall in an Applied
Magnetic Field",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "284--290",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0284",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391993",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Geldermans:1967:CCM,
author = "P. Geldermans and H. O. Leilich and T. R. Scott",
title = "Characteristics of the Chain Magnetic Film Storage
Element",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "291--301",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0291",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391994",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abbas:1967:DCC,
author = "S. A. Abbas and H. F. Koehler and T. C. Kwei and H. O.
Leilich and R. H. Robinson",
title = "Design Considerations for the Chain Magnetic Storage
Array",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "302--311",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0302",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391995",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Quarles:1967:CMG,
author = "D. A. {Quarles, Jr.} and K. Spielberg",
title = "A computer model for global study of the general
circulation of the atmosphere",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "312--336",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0312",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391996",
ZMnumber = "204.25002",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McGroddy:1967:NCI,
author = "J. C. McGroddy and M. I. Nathan",
title = "A New Current Instability in {N}-type Germanium",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "337--340",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0337",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391997",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPIc,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "341--354",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0341",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391998",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRIc,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "355--356",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0355",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391999",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Ac,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "357--358",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.113.0357",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392000",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPIa,
author = "Anonymous",
title = "Contents of previous issue",
journal = j-IBM-JRD,
volume = "11",
number = "3",
pages = "359--359",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5392001",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:13 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392001",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PCP,
author = "Anonymous",
title = "Preface to Controls Papers",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "360--360",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0360",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391940",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Robbins:1967:GLC,
author = "H. M. Robbins",
title = "A Generalized Legendre-Clebsch Condition for the
Singular Cases of Optimal Control",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "361--372",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0361",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391941",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brown:1967:RCO,
author = "K. R. Brown and G. W. Johnson",
title = "Rapid Computation of Optimal Trajectories",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "373--382",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0373",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391942",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roberts:1967:SRT,
author = "S. M. Roberts and J. S. Shipman",
title = "Some Results in Two-Point Boundary Value Problems",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "383--388",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0383",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.62",
MRnumber = "35 \#5144",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391943",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Astrom:1967:CCP,
author = "K. J. Astrom",
title = "Computer Control of a Paper Machine --- an Application
of Linear Stochastic Control Theory",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "389--405",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0389",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391944",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dahlin:1967:LIP,
author = "E. B. Dahlin",
title = "On-Line Identification of Process Dynamics",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "406--426",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0406",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391945",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Budurka:1967:SCO,
author = "W. J. Budurka",
title = "Sensitivity Constrained Optimal Control Synthesis",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "427--435",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0427",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391946",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chang:1967:STS,
author = "A. Chang",
title = "Synchronization of Traffic Signals in Grid Networks",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "436--441",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0436",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391947",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gilson:1967:DPS,
author = "L. A. Gilson and E. F. Harrold and F. G. Kilmer",
title = "Design Principles for Sampled-Data Systems with
Application to Attitude Control of a Large, Flexible
Booster",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "442--451",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0442",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391948",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stuehler:1967:COM,
author = "J. E. Stuehler and R. V. Watkins",
title = "A Computer-Operated Manufacturing and Test System",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "452--460",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0452",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391949",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pliskin:1967:PIT,
author = "W. A. Pliskin and P. D. Davidse and H. S. Lehman and
L. I. Maissel",
title = "Properties of Insulating Thin Films Deposited by {RF}
Sputtering",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "461--467",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0461",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391950",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mee:1967:MMS,
author = "C. D. Mee",
title = "The Magnetization Mechanism in Single-Crystal Garnet
Slabs Near the Compensation Temperature",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "468--476",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0468",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391951",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPId,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "477--483",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0477",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391952",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRId,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "484--485",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0484",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391953",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Ad,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "486--488",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.114.0486",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391954",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPTc,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "11",
number = "4",
pages = "490--491",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5391955",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:15 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391955",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Maling:1967:RCD,
author = "G. C. Maling and K. S. Nordby",
title = "Reverberation Chamber Determination of the Acoustic
Power of Pure-Tone Sources",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "492--501",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0492",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391957",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Myers:1967:EBS,
author = "R. A. Myers and R. V. Pole",
title = "The Electron Beam Scanlaser: Theoretical and
Operational Studies",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "502--510",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0502",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391958",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Delaney:1967:MCP,
author = "R. A. Delaney and H. D. Kaiser",
title = "Multiple-Curie-Point Capacitor Dielectrics",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "511--519",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0511",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391959",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brennemann:1967:TIT,
author = "A. E. Brennemann and A. V. Brown and M. Hatzakis and
A. J. Speth and R. F. M. Thornley",
title = "Two Interconnection Techniques for Large-Scale Circuit
Integration",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "520--526",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0520",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391960",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lin:1967:ETR,
author = "Tung-Po Lin",
title = "Estimation of Temperature Rise in Electron Beam
Heating of Thin Films",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "527--536",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0527",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391961",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fowler:1967:NIT,
author = "M. E. Fowler and R. M. Warten",
title = "A numerical integration technique for ordinary
differential equations with widely separated
eigenvalues",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "537--543",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0537",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.61",
MRnumber = "35 \#7586",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391962",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "J. W. Daniel",
}
@Article{Rutz-Philipp:1967:PCN,
author = "E. M. Rutz-Philipp",
title = "Power Conversion in Nonlinear Resistive Elements
Related to Interference Phenomena",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "544--552",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0544",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391963",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mills:1967:E,
author = "H. D. Mills",
title = "On the Equation $i = i_0 [\exp \alpha (v - {R} i) -
1]$",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "553--554",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0553",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391964",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Daughton:1967:DWE,
author = "J. M. Daughton and G. E. Keefe and K. Y. Ahn and C.-C.
Cho",
title = "Domain Wall Energy Measurements using Narrow
Permalloy Strips",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "555--557",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0555",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391965",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mullick:1967:PSN,
author = "S. K. Mullick",
title = "Propagation of Signals in Nonlinear Transmission
Lines",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "558--562",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0558",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391966",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Flur:1967:MPS,
author = "B. L. Flur",
title = "On the Magnetic Properties of Sputtered {NiFe} Films",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "563--569",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0563",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391967",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPIe,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journal",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "570--578",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0570",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391968",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRIe,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "579--580",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0579",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391969",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Ae,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "581--582",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.115.0581",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391970",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPIb,
author = "Anonymous",
title = "Contents of previous issue",
journal = j-IBM-JRD,
volume = "11",
number = "5",
pages = "583--583",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5391971",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:17 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391971",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kolsky:1967:SCA,
author = "H. G. Kolsky",
title = "Some Computer Aspects of Meteorology",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "584--600",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0584",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391905",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Samuel:1967:SSM,
author = "A. L. Samuel",
title = "Some Studies in Machine Learning Using the Game of
Checkers. {II} --- Recent progress",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "601--617",
month = nov,
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0601",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391906",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haughton:1967:SMT,
author = "K. E. Haughton",
title = "Similar Motion of Two-Degree-of-Freedom Nonlinear
Vibrating Systems with Nonsymmetric Springs",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "618--626",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0618",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391907",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sedore:1967:SPA,
author = "S. R. Sedore",
title = "{SCEPTRE}: a program for automatic network analysis",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "627--637",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0627",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391908",
ZMnumber = "189.17103",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Remley:1967:STF,
author = "W. R. Remley",
title = "Synthesis of Transfer Functions in a Prescribed
Frequency Band",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "638--642",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0638",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391909",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boone:1967:ECM,
author = "J. W. Boone and H. S. Todd",
title = "Exposure Control in a Multi-Stage Photographic
System",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "643--647",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0643",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391910",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Standish:1967:TRR,
author = "C. J. Standish",
title = "Two Remarks on the Reconstruction of Sampled
Non-Bandlimited Functions",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "648--649",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0648",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391911",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:TPIf,
author = "Anonymous",
title = "Technical Papers by {IBM} Authors Published Recently
in Other Journals",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "650--661",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0650",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391912",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:PRIf,
author = "Anonymous",
title = "Patents Recently Issued to {IBM} Inventors",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "662--663",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0662",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391913",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:Af,
author = "Anonymous",
title = "Authors",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "664--664",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.116.0664",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391914",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1967:CPTd,
author = "Anonymous",
title = "Contents of previous two issues",
journal = j-IBM-JRD,
volume = "11",
number = "6",
pages = "666--667",
month = "????",
year = "1967",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.1967.5391915",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 15:36:19 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391915",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McLean:1967:CMP,
author = "A. D. McLean and M. Yoshimine",
title = "Computation of Molecular Properties and Structure",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "206--233",
month = nov,
year = "1967",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Dec 04 11:38:05 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See supplemental volume \cite{McLean:1967:TLM}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ratajski:1968:FCS,
author = "J. M. Ratajski",
title = "Force-frequency coefficient of singly rotated
vibrating quartz crystals",
journal = j-IBM-JRD,
volume = "12",
number = "1",
pages = "92--9",
month = jan,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7760 (Piezoelectricity and electrostriction)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal properties; piezoelectric oscillations;
quartz",
}
@Article{Ahn:1968:SMP,
author = "K. Y. Ahn and J. F. Freedman",
title = "Some magnetic properties of vacuum-deposited coupled
films",
journal = j-IBM-JRD,
volume = "12",
number = "1",
pages = "100--109",
month = jan,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7570 (Magnetic films and multilayers)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "magnetic thin films",
}
@Article{Gregor:1968:PDF,
author = "L. V. Gregor",
title = "Polymer dielectric films",
journal = j-IBM-JRD,
volume = "12",
number = "2",
pages = "140--162",
month = mar,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7360 (Electronic properties of thin films); B2800
(Dielectric materials and devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "dielectric properties of solids; polymers; thin
films",
}
@Article{Tuel:1968:CAS,
author = "W. G. {Tuel, Jr.}",
title = "Computer algorithm for spectral factorization of
rational matrices",
journal = j-IBM-JRD,
volume = "12",
number = "??",
pages = "163--170",
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 12:01:15 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "155.48704",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ghosh:1968:AFG,
author = "S. P. Ghosh and C. T. Abraham",
title = "Application of finite geometry in file organization
for records with multiple-valued attributes",
journal = j-IBM-JRD,
volume = "12",
number = "2",
pages = "180--187",
month = mar,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 06 20:57:46 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dowley:1968:SLA,
author = "M. W. Dowley and W. L. Peticolas",
title = "The study of laser-induced absorption of a secondary
light beam in molecular liquids and solutions",
journal = j-IBM-JRD,
volume = "12",
number = "2",
pages = "188--191",
month = mar,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3000 (Atomic and molecular physics); A7820 (Optical
properties of bulk materials)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "laser beam effects; light absorption; optical
properties of; organic compounds; substances",
}
@Article{McLean:1968:CMP,
author = "A. D. McLean and M. Yoshimine",
title = "Computation of Molecular Properties and Structure",
journal = j-IBM-JRD,
volume = "12",
number = "3",
pages = "206--233",
month = may,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650 (Data handling and computation); A3120 (Specific
calculations and results for atoms and molecules)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complete computer programs; molecular electronic
structure",
}
@Article{Makous:1968:ELH,
author = "W. L. Makous and J. D. Gould",
title = "Effects of lasers on the human eye",
journal = j-IBM-JRD,
volume = "12",
number = "3",
pages = "234--211",
month = may,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4260 (Laser systems and laser beam applications);
A8732 (Physiological optics, vision); A8750E
(Bio-optics (effects of microwaves, light, laser and
other electromagnetic waves))",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "biological effects of radiation; eye; laser beam
effects",
}
@Article{Kennedy:1968:TDM,
author = "D. P. Kennedy and P. C. Murley",
title = "A two-dimensional mathematical analysis of the
diffused semiconductor resistor",
journal = j-IBM-JRD,
volume = "12",
number = "??",
pages = "242--250",
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "212.49001",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hennis:1968:IOP,
author = "R. B. Hennis",
title = "The {IBM 1975} optical page reader. {I}: System
design",
journal = j-IBM-JRD,
volume = "12",
number = "5",
pages = "346--353",
month = sep,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "character recognition equipment",
}
@Article{Bartz:1968:IOP,
author = "M. R. Bartz",
title = "The {IBM 1975} optical page reader. {II}: Video
thresholding system",
journal = j-IBM-JRD,
volume = "12",
number = "5",
pages = "354--363",
month = sep,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "character recognition equipment",
}
@Article{Andrews:1968:IOP,
author = "D. R. Andrews and A. J. Atrubin and K. C. Hu",
title = "The {IBM 1975} optical page reader. {III}: Recognition
logic development",
journal = j-IBM-JRD,
volume = "12",
number = "5",
pages = "364--371",
month = sep,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "character recognition equipment",
}
@Article{Brown:1968:TCM,
author = "C. J. Brown and J. T. Ma",
title = "Time-optimal control of a moving-coil linear
actuator",
journal = j-IBM-JRD,
volume = "12",
number = "5",
pages = "372--379",
month = sep,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1330 (Optimal control); C3260 (Actuating and final
control devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "actuators; optimal control",
}
@Article{Kennedy:1968:MIA,
author = "D. P. Kennedy and P. C. Murley and W. Kleinfelder",
title = "On the measurement of impurity atom distributions in
silicon by the differential capacitance technique",
journal = j-IBM-JRD,
volume = "12",
number = "5",
pages = "399--409",
month = sep,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280C (Conductivity of
elemental semiconductors); B2550 (Semiconductor device
technology); A6170W (Impurity concentration,
distribution, and gradients)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal impurities; elemental semiconductors;
measurement; semiconductor materials; silicon",
}
@Article{Oldham:1968:EDC,
author = "I. B. Oldham and R. T. Chien and D. T. Tang",
title = "Error detection and correction in a photo-digital
storage system",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "422--430",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320Z (Other digital storage)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "digital storage",
}
@Article{Brayton:1968:SSC,
author = "R. K. Brayton",
title = "Small-signal stability criterion for electrical
networks containing lossless transmission lines",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "431--440",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1150D (Lumped linear networks)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "lumped parameter networks; transmission line theory",
}
@Article{Ku:1968:CLD,
author = "T. C. Ku and J. H. Ramsey and W. C. Clinton",
title = "Calculation of liquid droplet profiles from
closed-form solution of {Young-Laplace} equation",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "441--447",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "187.49401",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755K (Multiphase flows)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "drops",
}
@Article{Segmuller:1968:XDT,
author = "A. Segmuller",
title = "{X}-ray diffraction topography of germanium wafers",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "448--457",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170 (Defects in crystals); A6480G (Microstructure)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal defects; crystal microstructure; elemental;
germanium; semiconductors; X-ray diffraction",
}
@Article{Morehead:1968:PJZ,
author = "F. F. Morehead and B. L. Crowder",
title = "Photo-$n$--$p$ junctions in {ZnTe}",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "458--464",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7960 (Photoemission and photoelectron spectra
(condensed matter)); B4260 (Electroluminescent
devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "junctions; light sources; photoemissive devices;
semiconductor; zinc compounds",
}
@Article{Strong:1968:AGR,
author = "H. R. Strong",
title = "Algebraically generalized recursive function theory",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "465--475",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "02.70",
MRnumber = "41 \#6689",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "185.01903",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0210 (Algebra); C1110 (Algebra)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebra; set theory",
}
@Article{Dhaka:1968:DFS,
author = "V. A. Dhaka",
title = "Design and fabrication of subnanosecond current switch
and transistors",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "476--482",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); B2570
(Semiconductor integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "monolithic integrated circuits; switches;
transistors",
}
@Article{Gereth:1968:NAE,
author = "R. Gereth and M. E. Cowher",
title = "New annealing effects on the bulk corrosion potential
of germanium",
journal = j-IBM-JRD,
volume = "12",
number = "6",
pages = "483--485",
month = nov,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "corrosion; heat treatment; semiconductor materials",
}
@Article{Pliskin:1968:RTC,
author = "W. A. Pliskin and R. A. Wesson",
title = "Reflectivity thickness corrections for silicon dioxide
films on silicon for {VAMFO} (variable angle
monochromatic fringe observation)",
journal = j-IBM-JRD,
volume = "12",
number = "2",
pages = "792--794",
month = mar,
year = "1968",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A6800
(Surfaces and interfaces; thin films and whiskers);
A7820 (Optical properties of bulk materials)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "compounds; light interferometry; optical films;
reflectivity; silicon; thickness measurement",
}
@Article{Cole:1969:CXL,
author = "H. Cole",
title = "Computer-operated {X}-ray laboratory equipment",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "5--14",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "instrumentation",
}
@Article{Grant:1969:AWG,
author = "P. M. Grant",
title = "Automation of a wide-range, general-purpose
spectrophotometric system",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "15--27",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765 (Optical spectroscopy and spectrometers); C7300
(Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "instrumentation; spectrophotometers",
}
@Article{McCann:1969:NRT,
author = "G. D. McCann",
title = "New research techniques for the life sciences",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "28--35",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition); C7300
(Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "biology; data reduction and analysis; pattern
recognition",
}
@Article{Johnson:1969:CS,
author = "B. Johnson and T. Kuga and H. M. Gladney",
title = "Computer-assisted spectroscopy",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "36--45",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0758 (Magnetic resonance spectrometers, auxiliary
instruments and techniques); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complete computer programs; instrumentation;
paramagnetic; radiofrequency spectrometers; resonance",
}
@Article{Wilburn:1969:COA,
author = "N. P. Wilburn and L. D. Coffin",
title = "Combination of on-line analysis with collection of
multicomponent spectra in an on-line computer",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "46--51",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2960 (Counting circuits and nuclear electronics);
B7430 (Counting circuits and electronics for particle
physics); C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "apparatus; instrumentation; particle detectors;
radioactivity measuring",
}
@Article{Birnbaum:1969:IGS,
author = "J. Birnbaum and T. Kwap and M. Mikelsons and P.
Summers and J. F. Schofield and F. Carrubba",
title = "An interactive graphics system for nuclear data
acquisition",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "52--60",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2000 (Nuclear physics); C7300 (Natural sciences
computing); C5540 (Terminals and graphic displays)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer graphic equipment; data acquisition; nuclear;
nuclear systems; physics",
}
@Article{Byerley:1969:SER,
author = "J. J. Byerley and T. Z. Fahidy",
title = "Simulation and experimental research",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "61--4",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350C (Control applications in metallurgical
industries); C7490 (Computing in other engineering
fields)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chemical technology; metallurgical industries;
simulation",
}
@Article{Lusebrink:1969:CFL,
author = "T. R. Lusebrink and C. H. Sederholm",
title = "Computer facilities for the laboratory",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "65--74",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "instrumentation; time-sharing programs",
}
@Article{Fryklund:1969:UTC,
author = "J. Fryklund and W. Loveland",
title = "Use of a time-sharing computer in nuclear chemistry",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "75--8",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "natural sciences; time-sharing systems",
}
@Article{Hannon:1969:COS,
author = "D. M. Hannon and D. E. Horne and K. L. Foster",
title = "Computer-controlled optical spectrometer",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "79--86",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765 (Optical spectroscopy and spectrometers); A4280D
(Optical monochromators); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complete computer programs; instrumentation;
monochromators",
}
@Article{Mollenauer:1969:GLC,
author = "J. F. Mollenauer",
title = "Growth of a laboratory computer system for nuclear
physics",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "87--92",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2000 (Nuclear physics); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer facilities; nuclear physics; physics",
}
@Article{Davis:1969:MOT,
author = "J. B. Davis and H. H. Herd",
title = "Measuring optical transfer functions of lenses with
the aid of a digital computer",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "93--103",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4210F (Edge and boundary effects, optical
refraction); A4230L (Modulation and optical transfer
functions); A4230 (Optical information, image formation
and analysis); A4278 (Optical lens and mirror systems);
C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complete computer programs; instrument testing;
instrumentation; lenses; optical; optics",
}
@Article{Bell:1969:UCA,
author = "R. T. Bell and H. Overas",
title = "The use of computers at {CERN}",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "104--113",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2000 (Nuclear physics); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "nuclear physics; physics",
}
@Article{Reich:1969:EST,
author = "H. A. Reich",
title = "An experimental system for time-shared, on-line data
acquisition",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "114--118",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data acquisition; data communication systems; systems;
time-sharing",
}
@Article{Bevington:1969:RRN,
author = "P. R. Bevington",
title = "Real-time reduction of nuclear physics data",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "119--125",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2000 (Nuclear physics); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data reduction and analysis; nuclear physics;
physics",
}
@Article{Okaya:1969:UCC,
author = "Y. Okaya",
title = "The use of a control computer in a chemistry
department",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "126--131",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "natural sciences",
}
@Article{Konnerth:1969:UTS,
author = "K. L. Konnerth",
title = "Use of a terminal system for data acquisition",
journal = j-IBM-JRD,
volume = "13",
number = "1",
pages = "132--138",
month = jan,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data acquisition; data communication equipment;
online; operation; time-sharing systems",
}
@Article{Lesem:1969:KNW,
author = "L. B. Lesem and P. M. Hirsch and J. A. {Jordan, Jr.}",
title = "The kinoform: a new wavefront reconstruction device",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "150--155",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4350 (Holography); C7410B (Power engineering
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer applications; computers; electronics
applications of; holography; optics",
}
@Article{Gabor:1969:AHM,
author = "D. Gabor",
title = "Associative holographic memories",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "156--159",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4350 (Holography)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "holography",
}
@Article{Brown:1969:CBH,
author = "B. R. Brown and A. W. Lohmann",
title = "Computer-generated binary holograms",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "160--168",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4350 (Holography); C7410B (Power engineering
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electronics applications of computers; holography;
optics",
}
@Article{Wieder:1969:EBW,
author = "H. Wieder and R. V. Pole and P. F. Heidrich",
title = "Electron beam writing of spatial filters",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "169--171",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4150 (Electro-optical devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electro-optical effects; electron beam applications;
filters",
}
@Article{Gracer:1969:GCD,
author = "F. Gracer and R. A. Myers",
title = "Graphic computer-assisted design of optical filters",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "172--178",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7300 (Natural sciences computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer graphics; computer-aided design; optics",
}
@Article{Rabedeau:1969:STI,
author = "M. E. Rabedeau",
title = "Switchable total internal reflection light deflector",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "179--183",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4210 (Optical propagation and transmission in
homogeneous media); A4230 (Optical information, image
formation and analysis); C5320Z (Other digital
storage)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "light reflection; optical storage devices; optical
systems",
}
@Article{Tibbetts:1969:HPR,
author = "R. E. Tibbetts and J. S. Wilczynski",
title = "High performance reduction lenses for microelectronic
circuit fabrication",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "192--196",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "integrated circuit production; optics; photography",
}
@Article{Chaudhari:1969:MSR,
author = "P. Chaudhari",
title = "Mechanisms of stress relief in polycrystalline films",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "197--204",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6220 (Mechanical properties of solids (related to
microscopic structure)); A7360 (Electronic properties
of thin films)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "films; internal stresses",
}
@Article{Surkan:1969:SPO,
author = "A. J. Surkan",
title = "Symbolic polynomial operations with {APL}",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "209--211",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1120 (Mathematical analysis); C6140D (High level
languages)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebra; procedure oriented languages",
}
@Article{Kennedy:1969:MIA,
author = "D. P. Kennedy and R. R. O'Brien",
title = "On the measurement of impurity atom distributions by
the differential capacitance technique",
journal = j-IBM-JRD,
volume = "13",
number = "2",
pages = "212--214",
month = mar,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal atomic structure; crystal impurities;
materials; semiconductor",
}
@Article{Totta:1969:SDM,
author = "P. A. Totta and R. P. Sopher",
title = "{SLT} device metallurgy and its monolithic extension",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "226--238",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1260 (Pulse circuits); B1265 (Digital electronics);
B2550E (Surface treatment for semiconductor devices);
B2570 (Semiconductor integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "hybrid integrated circuits; integrated circuits; logic
circuits; monolithic",
}
@Article{Miller:1969:CCR,
author = "L. F. Miller",
title = "Controlled collapse reflow chip joining",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "239--250",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "integrated circuit production; soldering",
}
@Article{Goldmann:1969:GOC,
author = "L. S. Goldmann",
title = "Geometric optimization of controlled collapse
interconnections",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "251--265",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "integrated circuit production; soldering",
}
@Article{Norris:1969:RCC,
author = "K. C. Norris and A. H. Landzberg",
title = "Reliability of controlled collapse interconnections",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "266--271",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B2220 (Integrated circuits);
B2570 (Semiconductor integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "integrated circuit production; reliability",
}
@Article{Oktay:1969:PST,
author = "S. Oktay",
title = "Parametric study of temperature profiles in chips
joined by controlled collapse techniques",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "272--285",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "integrated circuit production; temperature
distribution",
}
@Article{Berry:1969:SSC,
author = "B. S. Berry and I. Ames",
title = "Studies of the {SLT} chip terminal metallurgy",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "286--296",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electrical contacts; integrated circuit production;
soldering",
}
@Article{Miranker:1969:PMA,
author = "W. L. Miranker",
title = "Parallel Methods for Approximating the Root of a
Function",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "297--301",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.50",
MRnumber = "39 \#1109",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0220 (Mathematical analysis); C1120 (Mathematical
analysis)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "approximation theory; function evaluation; iterative;
mathematics; methods",
}
@Article{Dave:1969:SER,
author = "J. V. Dave",
title = "Scattering of electromagnetic radiation by a large,
absorbing sphere",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "302--313",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4110H (Electromagnetic waves: theory); B5210
(Electromagnetic wave propagation)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electromagnetic wave scattering",
}
@Article{Hill:1969:GMO,
author = "Y. M. Hill and N. O. Reckord and D. R. Winner",
title = "A general method for obtaining impedance and coupling
characteristics of practical microstrip and triplate
transmission line configurations",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "314--322",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1310 (Waveguides)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "strip lines",
}
@Article{Janak:1969:TEC,
author = "J. F. Janak",
title = "Thermal expansion in a constrained elastic cylinder",
journal = j-IBM-JRD,
volume = "13",
number = "3",
pages = "323--330",
month = may,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6570 (Thermal expansion and thermomechanical
effects)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "stress analysis; thermal expansion",
}
@Article{Abraham:1969:SMM,
author = "C. T. Abraham and R. D. Prasad",
title = "Stochastic model for manufacturing cost estimating",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "343--350",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "271.90013",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290D (Systems theory applications in economics and
business); C1290F (Systems theory applications in
industry)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "economics; manufacturing processes; modelling",
}
@Article{elAgizy:1969:DIM,
author = "M. N. {el Agizy}",
title = "Dynamic inventory models and stochastic programming",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "351--356",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "management; modelling",
}
@Article{Evers:1969:PAC,
author = "W. H. Evers and S. S. Thakur",
title = "Programmed automatic customer engineer ({PACE})
dispatch",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "357--365",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "management science",
}
@Article{Savir:1969:MCT,
author = "D. Savir",
title = "Model of competition in a two-seller market",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "366--372",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290D (Systems theory applications in economics and
business); C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "marketing; modelling; operations research",
}
@Article{Arinal:1969:MBU,
author = "J.-C. Arinal",
title = "Maximal biflow in an undirected network",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "373--379",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "39 \#5245",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "275.90039",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290D (Systems theory applications in economics and
business); C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "marketing; operations research",
}
@Article{Donath:1969:AAB,
author = "W. E. Donath",
title = "Algorithm and average-value bounds for assignment
problems",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "380--386",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry);
C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "management science; operations research",
}
@Article{Hu:1969:SDA,
author = "T. C. Hu and W. T. Torres",
title = "Shortcut in the decomposition algorithm for shortest
paths in a network",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "387--390",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "39 \#5251",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry);
C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "operations research; PERT; subroutines",
}
@Article{Raimond:1969:MPD,
author = "J.-F. Raimond",
title = "Minimaximal paths in disjunctive graphs by direct
search",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "391--399",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.30",
MRnumber = "39 \#5252",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "251.90049",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry);
C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "control; manufacturing processes; operations research;
process; production",
}
@Article{Raymond:1969:HAT,
author = "T. C. Raymond",
title = "Heuristic algorithm for the traveling-salesman
problem",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "400--407",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290D (Systems theory applications in economics and
business); C1290F (Systems theory applications in
industry); C1290 (Applications of systems theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "economics; management science; operations research;
subroutines",
}
@Article{Corby:1969:IVD,
author = "B. Corby",
title = "{IBM} 2750 voice and data switching system:
organization and functions",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "408--415",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210M (ISDN); B6230B (Electronic switching systems
and exchanges); B6230D (Other telephone exchanges)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "private telephone exchanges; switching systems",
}
@Article{Reynier:1969:ESN,
author = "R. E. Reynier",
title = "Electronic switching network of the {IBM} 2750",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "416--427",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6230B (Electronic switching systems and exchanges);
B6230D (Other telephone exchanges)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "private telephone exchanges; switching circuits",
}
@Article{Colas:1969:OPI,
author = "J. D. Colas",
title = "Operational program for the {IBM} 2750",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "428--438",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6230 (Switching centres and equipment); C3370
(Control applications in telecommunications)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "communications applications of control; switching
systems",
}
@Article{Rosier:1969:SC,
author = "L. L. Rosier and C. Turrel and W. K. Liebmann",
title = "Semiconductor crosspoints",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "439--446",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560H (Junction and barrier diodes); B6230 (Switching
centres and equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "semiconductor devices; switching circuits",
}
@Article{Rocher:1969:RTT,
author = "E. Y. Rocher and R. E. Reynier",
title = "Response time of thyristors: theoretical study and
application to electronic switching networks",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "447--455",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560L (Thyristors and silicon controlled rectifiers);
B6230B (Electronic switching systems and exchanges)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "switching circuits; thyristors",
}
@Article{Griffith:1969:DRP,
author = "R. L. Griffith",
title = "Data recovery in a photo-digital storage system",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "456--467",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320Z (Other digital storage)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data acquisition; optical storage devices",
}
@Article{Mitchell:1969:MPE,
author = "F. H. {Mitchell, Jr.} and W. R. Mahaffey and R. F.
Jacob",
title = "Modeling plasma effects on radar cross section of
reentry vehicles",
journal = j-IBM-JRD,
volume = "13",
number = "4",
pages = "468--474",
month = jul,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6310 (Radar theory)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "plasma; radar cross-sections; space vehicles",
}
@Article{Bray:1969:PAI,
author = "R. Bray",
title = "A perspective on acoustoelectric instabilities",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "487--493",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Instabilities in piezoelectricallly active
semiconductors in terms of experiments on III-V
semiconductors, selected to limit or control variables;
detailed evidence is presented that source of acoustic
flux is thermal equilibrium phonon spectrum; individual
contributions of various factors to instabilities are
identified and discussed; several aspects of deviation
from small signal theory are identified.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators)",
corpsource = "Purdue Univ., Lafayette, IN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "acoustoelectric effects; piezoelectric; semiconductor
materials; semiconductors, acoustic effect",
}
@Article{Zemon:1969:PAF,
author = "S. Zemon and J. Zucker",
title = "Parametric Amplification and Frequency Shifts in the
Acoustoelectric Effect",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "494--499 (or 494--498??)",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Mechanisms for downshift in frequency of maximum
acoustic intensity for high flux domains in
piezoelectric semiconductors are reviewed; for simple
case where externally introduced acoustic wave (pump)
produces single-frequency domain in photoconducting
CdS, clear evidence is given that downshift is due to
parametric amplification of thermal acoustic noise;
downshifting in region where deviations from linear
theory are still small is discussed in terms of
parametric interaction model.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560F (Bulk effect devices); B2810F (Piezoelectric
and ferroelectric materials)",
corpsource = "General Telephone and Electronics Labs. Inc., Bayside,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "noise; parametric amplifiers; piezoelectric materials;
semiconductors, acoustic effect",
}
@Article{Spears:1969:BSS,
author = "D. L. Spears",
title = "{Brillouin} Scattering Study of Acoustoelectric Domain
Formation in $n$-{GaAs}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "499--502",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Brillouin scattering measurements in n-GaAs show that
initial formation of acoustoelectric domains is
consequence of spatially inhomogeneous amplification
produced by resistivity inhomogeneities, and that
subsequent stages of domain evolution involve
flux-dependent processes which further shape domain;
important process appears to be parametric frequency
conversion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6265 (Acoustic properties of solids); A7220
(Electrical conductivity phenomena in semiconductors
and insulators); A7835 (Brillouin and Rayleigh
scattering (condensed matter))",
corpsource = "M.I.T. Lexington, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "acoustic effects; acoustoelectric effects; arsenide;
Brillouin spectra; gallium; semiconductor materials;
semiconductors",
}
@Article{Moore:1969:OAD,
author = "A. R. Moore and R. W. Smith and P. Worcester",
title = "Off-Axis Acoustoelectric Domains in {CdS}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "503--506",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In CdS crystals oriented with electric drift field
parallel to c axis, acoustoelectric domains consist of
off-axis shear waves; stroboscopic strain-birefrigent
method was used to observe off-axis domains directly;
domain tilt angle has been found to depend on drift
velocity in roughly same way as predicted from
small-signal angular dependence theory; discrepancies
may be result of large-signal effects or of angular
dispersion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7250 (Acoustoelectric
effects (electronic transport)); A7820F (Birefringence
(condensed matter))",
corpsource = "RCA Labs. Princeton, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "acoustic effects; acoustoelectric effects;
birefringence; cadmium compounds; mechanical;
semiconductor materials; semiconductors",
}
@Article{Route:1969:AAI,
author = "R. K. Route and G. S. Kino",
title = "Acoustoelectric Amplification in {InSb}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "507--509",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In study of two modes of acoustoelectric domain
oscillation which occur in InSb in transverse magnetic
field, lithium niobate transducers on acoustic
amplifier were used to measure linear acoustic gain as
function of electric and magnetic field and frequency;
at low magnetic fields, wavelength of sound waves is
less than mean free path of electrons, and macroscopic
theories break down; extending microscopic theory of
magnetacoustic interactions to include electron drift
gives excellent agreement between theory and experiment
and results account for two modes of acoustic domain
formation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7250 (Acoustoelectric
effects (electronic transport))",
corpsource = "Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "acoustic effects; acoustoelectric effects; effects;
indium antimonide; magnetoacoustic; semiconductor
materials; semiconductors",
}
@Article{Pearson:1969:CSG,
author = "A. D. Pearson",
title = "Characteristics of Semiconducting Glass
Switching\slash Memory Diodes",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "510--514",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental studies of three conducting states
exhibited by semiconducting glass diodes, and memory
function they display when appropriately pulsed;
laboratory operation of simple diodes and methods of
inducing transitions among \%various states; possible
role of phase changes in mechanism of device operation;
new evidence in support of filamentary conduction
hypothesis.",
acknowledgement = ack-nhfb,
affiliation = "Murray Hill",
affiliationaddress = "Murray Hill, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560Z (Other semiconductor devices)",
corpsource = "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "diode; glass; memory devices; semiconductor devices;
semiconductor diodes; semiconductor storage devices;
semiconductors, switching",
}
@Article{Fritzsche:1969:PIA,
author = "U. H. Fritzsche",
title = "Physics of Instabilities in Amorphous Semiconductors",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "515--521 (or 515--520??)",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Four-fold classification of current-controlled
instabilities in amorphous semiconductors is proposed;
experimental evidence supporting simple band model for
amorphous covalent alloys is given; present
understanding of reversible switching effects and of
switching with memory is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2560Z (Other
semiconductor devices)",
corpsource = "Univ. Chicago, IL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "amorphous state; electric properties; modelling;
semiconductor materials; W R",
xxauthor = "H. Fritzsche",
}
@Article{Barnett:1969:CFS,
author = "A. M. Barnett",
title = "Current Filaments in Semiconductors",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "522--528",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Review of work that has been carried out on
double-injection current filaments, emphasizing similar
observations in direct-energy-gap semiconductor,
gallium arsenide and indirect-gap semiconductor,
silicon; experimental observations of current filaments
occurring in low-current region, where current
increases at constant voltage, and in high-current
power-law region; simplified theory that considers
current distribution of filament, and characteristic
curve in high-current power-law region.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B2560Z (Other
semiconductor devices)",
corpsource = "General Electric Co., Schenectady, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; semiconductor devices;
semiconductor materials",
}
@Article{Streetman:1969:COD,
author = "B. G. Streetman and N. {Holonyak, Jr.}",
title = "Current Oscillations in Deep-Level Doped
Semiconductors",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "529--532",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Review of various experimental observations of current
oscillations in p-i-n (and optically excited n-i-n)
devices containing deep levels which occur in positive
resistance region of spacecharge-limited current regime
of I-V characteristics, before occurrence of
double-injection breakdown; requirements which model
for oscillations must satisfy, and proposed model in
which recombination process unbalances steady or d-c
space charge.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560Z (Other semiconductor devices)",
corpsource = "Univ. Illinois, Champaign-Urbana, IL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "devices; electric properties; ion; JR; oscillations;
semiconductor; semiconductor device models",
xxauthor = "B. G. Streetman and J. {Holonyak, Jr.}",
}
@Article{Hagenlocher:1969:SCI,
author = "A. K. Hagenlocher and W. T. Chen",
title = "Space-charge-limited current instabilities in n$^+$ --
$\pi$ -- n$^+$ silicon diodes",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "533--536",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements of instability in nickel-doped 25,000
ohm-cm silicon when strength of pulsed electric field
is varied above and below threshold; at threshold
nickel centers become ionized, and positive space
charge is created in center of sample; this
nonequilibrium distribution, which persists for period
of 200 to 300 $\mu$ sec, has properties similar to
those of gaseous plasma.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560H (Junction and barrier diodes)",
corpsource = "General Telephone and Electronics Labs. Inc., Bayside,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; MJ; semiconductor devices, diode;
semiconductor diodes; semiconductors",
xxnote = "Check math in title??",
}
@Article{Rees:1969:TRH,
author = "H. D. Rees",
title = "Time Response of the High-Field Electron Distribution
Function in {GaAs}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "537--542",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Techniques used in iterative calculation of
steady-state and time-dependent high-field electron
distribution function for GaAs, its small-signal
frequency response and its behavior in large sinusoidal
electric fields; calculations concentrate on frequency
range from d-c to about 100 GHz; computed results for
response speed, threshold field for negative
conductivity, negative mobility, oscillator efficiency,
and free-electron dielectric constant.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology)",
corpsource = "Royal Radar Establ., Malvern, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric fields; electric properties; hem;
semiconductor materials; semiconductors",
}
@Article{McGroddy:1969:NCE,
author = "J. C. McGroddy and M. I. Nathan and J. E. {Smith,
Jr.}",
title = "Negative conductivity effects and related phenomena in
germanium. {I}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "543--553",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Review of recent work on current instabilities, caused
by bulk negative differential conductivity in extrinsic
material, and related properties of germanium in high
electric fields; general subject of high field
transport in n-Ge with emphasis on concept of saturated
drift velocity; transferred carrier mechanism for
producing bulk negative differential conductivity;
recent work on other materials is summarized.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280C (Conductivity of
elemental semiconductors); B2550 (Semiconductor device
technology)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; electrical conductivity;
electrical conductivity of solids; elemental
semiconductors; germanium; JR; semiconductor materials;
semiconductors",
}
@Article{Smith:1969:NCE,
author = "J. E. {Smith, Jr.} and M. I. Nathan and J. C.
McGroddy",
title = "Negative conductivity effects and related phenomena in
germanium. {II}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "554--561",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280C (Conductivity of
elemental semiconductors); B2550 (Semiconductor device
technology)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electrical conductivity; electrical conductivity of
solids; elemental semiconductors; germanium;
semiconductor materials",
}
@Article{Paige:1969:BND,
author = "E. G. S. Paige",
title = "Bulk negative differential conductivity in germanium:
theory",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "562--567",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280C (Conductivity of
elemental semiconductors); B2550 (Semiconductor device
technology)",
corpsource = "Royal Radar Establ., Malvern, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electrical conductivity; electrical conductivity of
solids; elemental semiconductors; germanium; Monte
Carlo methods; semiconductor materials",
}
@Article{Baynham:1969:WPN,
author = "A. C. Baynham",
title = "Wave Propagation in Negative Differential Conductivity
Media. {n-Ge}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "568--572",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In study of transverse electromagnetic wave
propagation in negative differential resistance medium
provided by suitably oriented n-type germanium at 77 K,
wave frequency is chosen to fall below critical
scattering rates in this system (1 GHz), and sample
dimensions are maintained below critical length for
domain formation; wave amplification is noted and real
and imaginary parts of conductivity are evaluated
throughout d-c bias field range of range of
resistivities.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280C (Conductivity of
elemental semiconductors); A7820 (Optical properties of
bulk materials)B2560Z (Other semiconductor devices);
B5210 (Electromagnetic wave propagation)",
corpsource = "Royal Radar Establ., Malvern, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; electromagnetic wave propagation;
elemental semiconductors; germanium; media; resistance
(electric); Ru; semiconductors",
}
@Article{Boer:1969:TCF,
author = "K. W. Boer",
title = "Trap-Controlled Field Instabilities in Photoconducting
{CdS} Caused by Field-Quenching",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "573--579",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Formation of stationary high-field domains adjacent to
cathode or anode, dependent on contact potential of
electrodes, their widening with increased applied
voltage and their transition into two types of moving
domains; domains which move under deformation of domain
profile and usually dissolve before they reach anode,
and nearly undeformed moving domains; structure and
kinetics of these domains are directly observed using
Franz-Keldysh effect and photographs of typical domain
forms are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4200 (Optoelectronic materials and devices)",
corpsource = "Univ. Delaware, Newark, DE, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "photoconducting materials; photoelectric;
semiconductors",
xxauthor = "K. W. Boeer",
}
@Article{McGroddy:1969:EHP,
author = "J. C. McGroddy and M. I. Nathan and W. Paul and S.
Porowski and J. E. {Smith, Jr.} and W. P. Dumke",
title = "Effects of Hydrostatic Pressure on Hot-Electron
Phenomena in {n-InSb}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "580--582",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In study of effect of hydrostatic pressure on Gunn
effect (high pressures) and bulk avalanche breakdown
(low pressures) in n-InSb, measured generation rates of
electron-hole pairs at 77 and 195 K at several
pressures are compared with theory of Dumke.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7000 (Condensed matter: electronic structure,
electrical, magnetic, and optical properties); A7220
(Electrical conductivity phenomena in semiconductors
and insulators)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "effect; electric breakdown; electric breakdown of
solids; electric properties; Gunn; high-pressure
phenomena and effects; III-V; indium antimonide; JR;
semiconductor materials; semiconductors",
}
@Article{Lorenz:1969:LCB,
author = "M. R. Lorenz and J. C. McGroddy and T. S. Plaskett and
S. Porowski",
title = "Location of the (111) conduction band minima in the
{Ga$_x$\slash In$_{1-x}$\slash Sb} alloy system",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "583--586",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:34:19 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Pressure dependence of resistivity and optical
absorption by conduction band electrons are used to
determine position of 111 (L') conduction band minima
in Ga In Sb alloy system; these experimental data
permit more precise estimate of position of L$_1$
minima than had been possible using Gunn effect data
alone.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B2550 (Semiconductor
device technology)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "alloys; band structure; electric properties; gallium
compounds; materials; semiconductor",
}
@Article{Shaw:1969:IBC,
author = "M. P. Shaw and P. R. Solomon and H. L. Grubin",
title = "Influence of Boundary Conditions on Current
Instabilities in {GaAs}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "587--590",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Excellent agreement is obtained among experiments
eliciting variety of GaAs current instabilities and
results of computer simulation of GaAs with various
fields imposed at cathode boundary; cathode boundary
field controls manifestation of instability and
determines whether Gunn effect or another instability
occurs; model is capable of predicting details of
various instabilities, and by comparing experiment with
theory, it is possible to determine carrier
concentration and drift mobility of each sample.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
corpsource = "United Aircraft Res. Lab., East Hartford, CT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; electrical conductivity of
solids; gallium arsenide; III-V; ion; semiconductor
materials; semiconductors",
}
@Article{Gunn:1969:TTD,
author = "J. B. Gunn",
title = "Topological Theory of Domain Velocity in
Semiconductors",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "591--595",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See comment \cite{Aas:1970:CTT}.",
abstract = "Theory is given for velocity of free, steadily
traveling domain of high electric field in
semiconductor exhibiting negative differential
conductivity; explicit results are derived for cases
for which domain behavior is dominated either by
(electric-field dependent) diffusion of electron, or by
rate of transfer of electrons between states having
different mobilities; solution for electric-field
distribution has required properties only if system of
differential equations involved possesses singular
points with special topological properties.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7170C (Crystal and ligand fields); A7220 (Electrical
conductivity phenomena in semiconductors and
insulators); A7280 (Conductivity of specific
semiconductors and insulators); B2550 (Semiconductor
device technology)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "crystal internal fields; electric properties;
semiconductor materials; semiconductors",
}
@Article{Bartelink:1969:ASF,
author = "D. J. Bartelink and D. L. Scharfetter",
title = "Avalanche Shock Fronts in {P-N} Junctions",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "596--600",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Conditions necessary for formation of avalanche shock
fronts, narrow layers of avalanche moving through diode
depletion layer faster than carrier saturated drift
velocity, are shown to be related to large-signal
limits of Read and more general avalanche transit time
diode theory; analysis of shock fronts by simple
analytic method has been used to interpret computer
simulations of high efficiency microwave oscillator
diodes; oscillation mode, called Trapatt mode, involves
compensated electron-hole plasma that is trapped in
depletion layer for portion of each cycle.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340 (Electrical and electronic properties of
interfaces); B1350F (Solid-state microwave circuits and
devices); B2530B (Semiconductor junctions); B2530
(Semiconductor junctions and interfaces); B2560H
(Junction and barrier diodes)",
corpsource = "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "junctions; microwave oscillators; semiconductor;
semiconductor diodes; semiconductors; shock waves",
}
@Article{Robinson:1969:CME,
author = "B. B. Robinson and G. A. Swartz",
title = "Coherent Microwave Emission from an Electron-Hole
Plasma",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "601--606",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Coherent microwave radiation, 6.5 to 44 GHz, is
generated by In Sb at 77 K with injected electron
current transverse to magnetic field; theory of
double-stream interaction in thin plasma layer with
magnetic field transverse to current flow predicts
instabilities in observed frequency range; theory
predicts all of qualitative and several of quantitative
features of observed emission; noise emission is
predicted and observed at temperatures up to room
temperature with appropriate onset magnetic fields.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B1350F (Solid-state
microwave circuits and devices); B2560Z (Other
semiconductor devices)",
corpsource = "RCA Labs., Princeton, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "materials; microwave generation; plasma stability;
semiconductor; semiconductors",
}
@Article{Persky:1969:NDM,
author = "G. Persky and D. J. Bartelink",
title = "Negative Differential Mobility in Nonparabolic Bands",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "607--610",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:08 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Strong NDM (negative differential mobility) in n-InSb
at low temperatures is predicted from single
nonparabolic band model; calculations allowing for
anisotropy of distribution function have been made
using drifted Maxwellian, and `two-temperature' model;
calculated NDM threshold field of 550 v/cm is in
observable field range in p-n junctions; in bulk
samples, where breakdown occurs at approximately 200
v/cm, domain nucleation may take place at high-field
inhomogeneities and contribute to dynamics of breakdown
process and attendant microwave emission.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
corpsource = "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; electrical conductivity of
solids; electron mobility; III-V; indium antimonide;
materials; modelling; semiconductor; semiconductors",
}
@Article{Turner:1969:RAW,
author = "C. W. Turner",
title = "The role of acoustic wave amplification in the
emission of microwave noise from {InSb}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "611--615",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630L (Measurement of basic electric and magnetic
variables)A4100 (Electricity and magnetism; fields and
charged particles); A6265 (Acoustic properties of
solids); A7000 (Condensed matter: electronic structure,
electrical, magnetic, and optical properties); A7220
(Electrical conductivity phenomena in semiconductors
and insulators); A7250 (Acoustoelectric effects
(electronic transport)); B1350F (Solid-state microwave
circuits and devices)",
corpsource = "Univ. California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acoustoelectric effects; crystal orientation; III-V;
indium antimonide; microwave generation; noise;
semiconductor materials; semiconductors",
}
@Article{Thompson:1969:NEI,
author = "A. H. Thompson and G. S. Kino",
title = "Noise emission from {InSb}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "616--620",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560F (Bulk effect devices)",
corpsource = "Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "magnetic fields; noise; probes; semiconductor
materials",
}
@Article{Ferry:1969:MEH,
author = "D. K. Ferry and W. A. Porter",
title = "Microwave Emission and High-Frequency Oscillations in
$n$-Type {InSb}",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "621--625",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In study of microwave emission from n-InSb and 77 K in
presence of electric and magnetic fields, rectangular
InSb samples were cut so that long dimension and
applied electric field were parallel to one of
crystallographic axes 100, 110, or 111 and so that
position of all other axes was known; instabilities in
voltage across InSb sample accompanied microwave
emission and, for limited range of electric and
magnetic fields, these instabilities were in form of
coherent oscillations; close correspondence between two
effects was demonstrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B1350F (Solid-state
microwave circuits and devices); B2560Z (Other
semiconductor devices)",
corpsource = "Texas Technol. Coll., Lubbock, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "em; microwave generation; semiconductor materials;
semiconductors",
}
@Article{Glicksman:1969:SME,
author = "M. Glicksman",
title = "Summary of Microwave Emission from {InSb}. Gross
Features and Possible Explanations",
journal = j-IBM-JRD,
volume = "13",
number = "5",
pages = "626--630",
month = sep,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Review of experimental observations of microwave
emission from InSb and theories proposed to explain
these; two sources for some of radiation,
acoustoelectric interaction and collision-induced
plasma instability, appear reasonably well established;
experiments are proposed to clarify number of still
unanswered questions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B1350F (Solid-state
microwave circuits and devices); B2560Z (Other
semiconductor devices)",
corpsource = "RCA Labs., Princeton, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research",
keywords = "acoustoelectric effects; microwave generation; plasma;
semiconductor materials; semiconductors; stability",
}
@Article{Marcus:1969:EDM,
author = "P. M. Marcus and F. P. Jona and D. W. Jepsen",
title = "Energy Diagram Method for {Bragg} Reflections in Low
Energy Electron Diffraction ({LEED}) Spectra",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "646--661",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A point of view and a method of calculation derived
from energy band theory are applied to the problem of
finding energies of Bragg reflections from a given
crystal. Energy curves are defined and calculated which
describe the behavior of individual diffracted electron
beams for a given set of beams incident on a particular
face of the crystal. Intersections of these curves
correspond to and identify the Bragg reflections
associated with each beam. Energy diagrams and Bragg
peak positions are shown for simple cubic face-centered
cubic lattices for various angles of incidence.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6114 (Electron determination of structures)",
corpsource = "IBM Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "crystals, electronic properties; electron diffraction
crystallography; physics; solid state; spectra; Te",
}
@Article{Kennedy:1969:TMA,
author = "D. P. Kennedy and R. R. O'Brien",
title = "Two-Dimensional Mathematical Analysis of a Planar Type
Junction Field-Effect Transistor",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "662--674",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This analysis of the steady-state mechanisms of
operation within the transistor shows that the
potential distribution within the source-drain channel
follows from solutions of Poisson's equation rather
than from Laplace's equation. In particular,
velocity-limited carrier transport produces a region of
carrier accumulation in a region of the source-drain
channel previously assumed to be depleted of carriers
by the gate junction space-charge layers. The results
are presented in graphic form.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM, E. Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "field effect; field effect transistors; mathematics;
transistors",
}
@Article{Jelinek:1969:FSD,
author = "F. Jelinek",
title = "Fast Sequential Decoding Algorithm Using a Stack",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "675--685",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "41 \#3166",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This algorithm, which uses stack storage at the
receiver, is much simpler to describe and analyze than
the Fano algorithm, and is about six times faster than
the latter at transmission rates equal to the rate
below which the average number of decoding steps is
bounded by a constant. Practical problems connected
with implementing the stack algorithm are discussed and
a scheme is described that facilitates satisfactory
performance even with limited stack storage capacity.
Preliminary simulation results estimating the decoding
effort and the needed stack size are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
corpsource = "Cornell Univ., Ithaca, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "algorithms; decoding; decoding algorithms; information
theory; me",
reviewer = "E. R. Berlekamp",
}
@Article{Pennebaker:1969:RSS,
author = "W. B. Pennebaker",
title = "{RF} sputtered strontium titanate films",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "686--695",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6870 (Whiskers and dendrites: growth, structure, and
nonelectronic properties); A7740 (Dielectric loss and
relaxation)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "dielectric properties of solids; films; sputtering;
strontium compounds",
}
@Article{Sawatzky:1969:CDR,
author = "E. Sawatzky and E. Kay",
title = "Cation Deficiencies in {RF} Sputtered Gadolinium Iron
Garnet Films",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "696--702",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "RF sputtering of stoichiometric, polycrystalline
gadolinium iron garnet material results in films
significantly deficient in iron content. The cation
deficiency is shown to be quite sensitive to
preparatory conditions and reflects itself markedly in
the magnetic and structural properties of the resultant
films. A simultaneously operated RF-D-C two-target
sputtering system is described in some detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6870 (Whiskers and dendrites: growth, structure, and
nonelectronic properties)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "ERI; films; gadolinium compounds; magnetic materials,
ferromagnet; RF sputtering; semiconductor devices,
film; sputtering; thin films",
}
@Article{Pehrson:1969:NDF,
author = "B. Pehrson",
title = "A nonlinear digital filter for industrial
measurements",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "703--710",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Time series arising from observations made on
industrial processes sometimes contain components that
make it necessary to use a nonlinear filter to extract
the signal. A simple algorithm is presented for
nonlinear filtering of a time series composed of a
Gaussian component, pulses and steps. The method used
is a combination of simple statistical techniques. The
main advantage is claimed to be a scheme for adaptation
of the filter parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1270 (Filters and other networks)",
corpsource = "Univ. Uppsala, Sweden",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "algorithms; automatic control, optimization; digital
filters; industrial plants; information theory; signal
processing; statistical methods",
}
@Article{Sugerman:1969:STD,
author = "A. Sugerman and S. Schmidt and Y. O. Tu",
title = "Strain and Temperature Distributions in a
Thermally-Activated Cantilever",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "711--716",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A mathematical model is used to predict the behavior
of an electromechanical semiconductor oscillator. The
device being simulated is a silicon cantilever, free at
one end, periodically heated on a small segment of one
surface by an embedded resistor, and having as heat
sink the fixed-end mechanical support (pedestal) on the
opposite surface. The model defines the strain and
temperature distributions in the cantilever as
functions of geometry, material constants, and input
power; its application is to determine the conditions
that will maximize strain in the region near the
pedestal for a specified power source.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "beams and girders; heat transfer; oscillators;
structural design, analogies",
}
@Article{Dixon:1969:MMP,
author = "R. C. Dixon and P. E. Boudreau",
title = "Mathematical Model for Pattern Verification",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "717--721",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Pattern verification is mathematically defined, an
appropriate decision function is derived, and a measure
of system evaluation is given. Two basic postulates are
set forth to fully define a verification system-each
known class is expected, with nonzero probability, to
be verified under the correct class label; and the
pattern vector extracted during verification should be
descriptive of the given class, independent of which
class lab\%l was entered into the system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1220 (Simulation, modelling and
identification)C1250 (Pattern recognition)",
corpsource = "IBM, Raleigh, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "analogies; modelling; pattern recognition; pattern
recognition systems; statistical methods",
}
@Article{Harris:1969:ODL,
author = "E. P. Harris and M. L. Dakss",
title = "Optical Damage to {LiNbO}$_3$ from {GaAs} Laser
Radiation",
journal = j-IBM-JRD,
volume = "13",
number = "6",
pages = "722--723",
month = nov,
year = "1969",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Optical damage to LiNbO$_3$ at room temperature from
focused cw GaAs laser radiation at a wavelength of 8450
A was observed. Visible damage was apparent after a
20-sec exposure corresponding to an energy flux of
about 1.2x10$_5$ J/cm$_2$ and was observed by changes
in the diffraction pattern of the crystal. This is
believed to be the first report of such damage in the
potentially useful wavelength range of 0.8 to 0.9 Um.
No damage was observed at a wavelength of 9030A in a
similar but pulsed-laser experiment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180B (Ultraviolet, visible and infrared radiation
effects)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "crystals; electron optics; gallium arsenide; laser
beam effects; light, high intensity; lithium compounds;
optical materials; optical properties; radiation
effects; ROG; semiconductor lasers",
}
@Article{Sedgwick:1970:DFG,
author = "T. O. Sedgwick and J. A. Aboaf and S. Krongelb",
title = "Dielectric films for {Ge} planar devices",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "2--11",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550E (Surface treatment for semiconductor devices);
B2550G (Lithography); B2560F (Bulk effect devices);
B2890 (Other dielectric applications and devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "masks; semiconductor devices; thin films",
}
@Article{Price:1970:THE,
author = "P. J. Price",
title = "The theory of hot electrons",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "12--24",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Methods of analysis of hot-electron phenomenon in
semiconductors are surveyed. Procedures for obtaining
and solving equations involving f only, based on a new
approach due to Levinson, are developed. An inherently
precise method for calculating f and related treatment
of differential mobility, which requires computer
implementation and which has recently come into use, is
expounded. Test calculations for the case of
n-germanium are reported.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electrical conductivity of solids; electron mobility;
elemental semiconductors; germanium; materials;
physics, solid state; semiconductor; semiconductors",
}
@Article{Gayles:1970:OFM,
author = "J. N. {Gayles, Jr.} and W. L. Honzik and D. O.
Wilson",
title = "On-Line Far-Infrared {Michelson} Interferometry in a
Time-Shared Mode",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "25--32",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method is described for implementing real-time
far-infrared Fourier spectroscopy in time-shared
environment. The system makes use of the IBM 1800
TSX-based General Experimental Monitor (GEM) and
reduces by at least an order of magnitude the time
between experiment initiation and the display of useful
spectral frequency and intensity information. The
system includes conversational mode operation with the
incomplete data array, permitting review at any
interval of the Fourier transform of the partially
acquired data without in any way disturbing the process
of data collection. Procedures are illustrated also for
performing signal averaging and several comparatively
routine spectroscopic tasks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765 (Optical spectroscopy and spectrometers); C5420
(Mainframes and minicomputers); C7300 (Natural sciences
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "Fourier analysis; instrumentation; light
interferometry; online operation; spectroscopy;
time-sharing systems",
}
@Article{Billingsley:1970:EHS,
author = "D. S. Billingsley",
title = "On the Equations of {Holland} in the Solution of
Problems in Multicomponent Distillation",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "33--40",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Holland developed certain equations to be used to
accelerate or induce convergence in multicomponent
distillation calculations. In practice this procedure
has been the most successful of any adjunct to the
basic Thiele-Geddes or Lewis-Matheson procedure for
solving these problems. It is of importance, therefore,
to ascertain the conditions under which the Holland
equations can be guaranteed to possess the required
type of solution at each iteration. The types of
specifications which fulfill these conditions are
determined.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "calculations; chemical processes; mathematics; VIG",
}
@Article{Bohlin:1970:MLM,
author = "T. Bohlin",
title = "On the maximum likelihood method of identification",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "41--51",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The maximum likelihood principle of estimation applied
to the linear black-box identification problem gives
model with theoretically attractive properties. Further
developments of the method are presented in the case of
a single output. The reliability and speed of the
identification algorithm have been improved, and the
method has been made easier to use. Rather
sophisticated computer program employs a generalized
model structure, an improved hill-climbing algorithm,
and an automatic procedure for determining model orders
and transport delays. Some statistics are given from
performance tests of the program on various processes
in paper production.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1220 (Simulation, modelling and identification);
C6150Z (Other systems operation programs)",
corpsource = "IBM Nordic Lab., Lidingo, Sweden",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "algorithms; analysis; automatic control; computers,
programming; identification; programming; statistical
methods; subroutines",
}
@Article{Schwartz:1970:ACS,
author = "G. C. Schwartz and R. E. Jones",
title = "Argon Content of {SiO}$_2$ Films Deposited by {RF}
Sputtering in Argon",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "52--60",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When SiO$_2$ is deposited by sputtering in an argon RF
glow discharge, the films so produced contain
considerable amounts of trapped argon, as determined by
X-ray fluorescence analysis. This argon content was
measured as a function of various sputtering
parameters-argon pressure, RF power, electrode spacing,
substrate temperature, and magnetic field, the latter
two being most influential. A simple theoretical model
for the capture and release of argon is presented which
explains an observed linear decrease of the argon
concentration in SiO$_2$ with increasing temperature.
Incorporation of argon into the sputtered SiO$_2$ film
does not seem to impair the film's ability to act as a
food passivating and insulating layer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A6860 (Physical properties of thin films,
nonelectronic)",
corpsource = "IBM Components Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "argon; electric insulating materials; films;
manufacture; physics; semiconductor devices; silicon
compounds; sorption; sputtering",
}
@Article{Esaki:1970:SND,
author = "L. Esaki and R. Tsu",
title = "Superlattice and Negative Differential Conductivity in
Semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "61--65",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:31:11 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The theory is studied for a one-dimensional periodic
potential, or `superlattice,' in monocrystalline
semiconductors formed by a periodic variation of alloy
composition or of impurity density introduced during
epitaxial growth. If the period of a superlattice, of
the order of 100A, is shorter than the electron mean
free path, a series of narrow allowed and forbidden
bands is expected due to the subdivision of the
Brillouin zone into a series of minizones. If the
scattering time of electrons meets a threshold
condition, the combined effect of the narrow energy
band and the narrow wave-vector zone makes it possible
for electrons to be excited with moderate electric
fields to an energy and momentum beyond an inflection
point in the E-k relation; this results in a negative
differential conductance in the direction of the
superlattice.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electric properties; electrical conductivity;
electrical conductivity of solids; physics, solid
state; semiconductor materials; semiconductors",
}
@Article{Overmeyer:1970:CCD,
author = "J. Overmeyer",
title = "Calculation of the Current Density in the Contacts of
a Thin Film Resistor",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "66--69",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The two-dimensional boundary value problem appropriate
to current flow in a film resistor is examined. A
simple closed-form solution for current density into
the contact is found to exist for the important case of
a thin film resistor with extended lands. The spatial
dependence of the current density into the contact is
found to be similar to that obtained by Kennedy and
Murley for the diffused resistor, with film thickness
entering the functional dependence in a role analogous
to the diffusion length of the dopant ion in the
diffused resistor.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2120 (Resistors); B2180 (Electrical contacts)",
corpsource = "IBM Components Div. Lab., E. Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "current distribution; electric resistors; electrical
contacts; film devices; films; integrated circuits;
resistors; thin; thin film resistors",
}
@Article{Russell:1970:IAL,
author = "S. S. Russell and S. L. Levine",
title = "Indium-Mercury Alloy as a Low-Toxicity Liquid
Electrode",
journal = j-IBM-JRD,
volume = "14",
number = "1",
pages = "70--71",
month = jan,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:11 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An alloy containing 2\% indium is recommended for use
as a liquid electrode in electronic manufacturing and
testing applications. Experimental studies show that
toxicity at 25 C can be substantially reduced by using
In-Hg alloys instead of pure Hg in the electrode bath.
Quite probably the vapor pressure would increase with
temperature, but it almost certainly would not exceed
the toxicity threshold at room temperatures normally
found in a laboratory or test facility. The long-term
toxicity is still a potential problem, and the alloy
does exhibit `hot spots' during electrical charging
that can produce mercury vapor. With suitable safety
precautions, however, there is low risk to the user.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering)",
corpsource = "IBM Components Div. Lab., E. Fishkill., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Research \& Development",
keywords = "electrodes; electronic; electronic equipment
manufacture; equipment testing; indium mercury alloys;
industrial hygiene; liquid electrodes; safety",
}
@Article{Drangeid:1970:DPS,
author = "K. E. Drangeid and R. S. Sommerhalder",
title = "Dynamic Performance of {Schottky-Barrier} Field Effect
Transistors",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "82--94",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The dynamic performance is analyzed to determine the
physical parameters on which the dynamic properties of
a FET depend, how strongly they influence the dynamic
qualities of FET's, and what recommendations can be
given as to proper choice of material or structure for
FET's with good high-frequency performance. Plots of
source-to-gate impedance, gain-to-drain impedance,
source-to-drain impedance and transconductance are
shown for the cases where there was available
information on the d-c conditions at the operating
point. The main result is that lumped FET's need not be
slow compared to bipolar transistors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "equivalent networks; erb; field effect; field effect
transistors; IBMJA; transistors; transistors, circuits;
transistors, models",
}
@Article{Kennedy:1970:CAT,
author = "D. P. Kennedy and R. R. O'Brien",
title = "Computer Aided Two-Dimensional Analysis of the
Junction Field-Effect Transistor",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "95--116",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A two-dimensional analysis is presented of the
mechanisms of operation for a junction field-effect
transistor. Particular emphasis is placed upon the
process of electric current saturation in both wide
gate and narrow gate structures. It is shown that
velocity saturated carrier transport in a source-drain
channel produces heretofore unreported mechanisms of
device operation. Comparisons made between the
conclusions derived from this two-dimensional analysis
and the conventional one-dimensional theory of junction
field-effect transistor operation are presented in
graphic form.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); C7410B (Power
engineering computing)",
corpsource = "IBM Components Div. Lab., E. Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "computer applications; computers; electronics
applications of; field effect; field effect
transistors; IBMJA; operating mechanisms; transistors;
transistors, models; two-dimensional analysis",
}
@Article{Middelhoek:1970:PMT,
author = "S. Middelhoek",
title = "Projection Masking, Thin Photoresist Layers and
Interference Effects",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "117--124",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When projection masking is used for producing
microwave semiconductor devices, standing light waves
can occur in the SiO$_2$ and photoresist layers,
leading to unexpected effects. Some of these effects
are described, and the experimental conditions under
which satisfactory masking results can be obtained are
explained.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits)",
corpsource = "IBM Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "IBMJA; integrated circuit production; manufacture;
masks; optics; photography, industrial applic;
photoresist layers; projection masking; semiconductor
devices",
}
@Article{Wolf:1970:MPS,
author = "P. Wolf",
title = "Microwave Properties of {Schottky-Barrier}
Field-Effect Transistors",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "125--141",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The microwave properties of silicon Schottky-barrier
field-effect transistors (MESFET's) with a gatelength
of 1 Um are investigated. The scattering parameters of
the transistors have been measured from 0.1 up to 12
GHz. From the measured data an equivalent circuit is
established which consists of an intrinsic transistor
and extrinsic elements. Some of the elements of the
intrinsic transistor, notably the transconductance, are
strongly influenced by the saturation of the drift
velocity. Best performance of the intrinsic transistor
is obtained with highly doped and thin channels. The
measured power-gain is in good agreement with
theoretical values deduced from the equivalent circuit.
The best device has a maximum frequency of oscillation
of 12 GHz. The investigation reveals that the extrinsic
elements, especially the resistance of the
gate-metallization, and the gate-pad parasticis,
degrade the power-gain considerably.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "equivalent circuits; field effect; field effect
transistors; IBMJA; transistors, circuits; transistors,
measurement; transistors, models",
}
@Article{Mohr:1970:SSP,
author = "Th. O. Mohr",
title = "Silicon and Silicon-Dioxide Processing for
High-Frequency {MESFET} Preparation",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "142--147",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Silicon wafer processing is described which provides
submicrometer epitaxial layers on top of
high-resistivity silicon substrates for fabrication of
high-frequency metal-semiconductor field-effect
transistors. Silicondioxide underetching at the border
of an oxide window, performed in hydrogen at elevated
temperatures, is one method of realizing 1-Um device
structures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "field effect transistors; IBMJA; manufacture;
semiconductor device manufacture; silicon and alloys;
silicon compounds; transistors; transistors, field
effect",
}
@Article{Middelhoek:1970:MPF,
author = "S. Middelhoek",
title = "Metallization Processes in Fabrication of
{Schottky-Barrier FET}'s",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "148--151",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The metallization processes necessary for the
production of microwave Schottky-barrier field-effect
transistors are described. Since the gate contact is
only 1 Um wide, the holes and the metallization of the
source, drain and gate contacts are produced
simultaneously. Then in a subsequent process, the
source and drain contacts are converted to ohmic
contacts by the evaporation of Au-Sb onto these
contacts. Mask alignment is not a problem because the
Au-Sb spreads across the surface after suitable heat
treatment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2560S (Other field effect devices)",
corpsource = "IBM Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "field effect transistors; IBMJA; manufacture;
metallizing; on; semiconductor device manufacture;
transistors, field effect",
}
@Article{Keyes:1970:MED,
author = "R. W. Keyes and R. Landauer",
title = "Minimal Energy Dissipation in Logic",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "152--157",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Minimal energy dissipations for the logic process
based on thermodynamics and general phase space
considerations are known. The actual availability of
these minimal dissipations has not, however, been
demonstrated. Thise minimal dissipation sources in a
computing system also act as noise sources and thereby
lead to questions about the ultimate available
reliability of the computing process. A new and
hypothetical device is presented in this paper and used
to construct a physically analyzable computing system.
It is demonstrated that this system has dissipations
larger than, but of the same order of magnitude as, the
original minimal quantities. It is also shown that any
required reliability can be obtained with this device,
without increased energy expenditure, but at the
expense of an increasing time per computational step.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210 (Logic design methods)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "automata theory; computers, reliability; IBMJA;
information theory; logic design; statistical
mechanics",
}
@Article{Keyes:1970:TPP,
author = "R. W. Keyes",
title = "Thermal Problems of the Pulsed Injection Laser",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "158--167",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Heat is produced in short periods of time during
pulsed operation of an injection laser. The temperature
of the laser at the beginning of any pulse due to the
heating caused by preceding pulses is calculated for
several simple model cases. The results are applied in
the description of performance deterioration caused by
heating.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255P (Lasing action in semiconductors); A4260 (Laser
systems and laser beam applications); B4320J
(Semiconductor lasers)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "analysis; IBMJA; lasers; lasers, semiconductor; niz;
semiconductor devices, thermal; semiconductor lasers",
}
@Article{Koenig:1970:ARD,
author = "H. R. Koenig and L. I. Maissel",
title = "Application of {RF} Discharges to Sputtering",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "168--171",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The operation of RF discharges is described and the
internal distribution of voltages is considered. The
significance of this with respect to sputtering,
particularly of insulators, is then discussed. An
equivalent circuit for the discharge is presented and
the influence of such parameters as pressure and
magnetic field on the components of this circuit is
described. Finally, energy distributions for positive
ions, electrons, and negative ions incident at the
substrate during deposition are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5280 (Electric discharges); A6180 (Radiation damage
and other irradiation effects); A6800 (Surfaces and
interfaces; thin films and whiskers); B0500 (Materials
science for electrical and electronic engineering);
B2315 (Gas discharges); B2810D (Dielectric breakdown
and discharges); B2810 (Dielectric materials and
properties)",
corpsource = "IBM Components Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "discharges (electric); films; films, dielectric;
IBMJA; ionization; plasmas; preparation; radio
equipment, manufacture; sputtering",
}
@Article{Logan:1970:CRS,
author = "J. S. Logan",
title = "Control of {RF} Sputtered Film Properties Through
Substrate Tuning",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "172--175",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A means has been found to control the RF potential of
the substrate during RF sputtering. The application of
this technique to the deposition of silica films has
been investigated in detail. The technique can be
described as the use of an adjustable RF impedance
between the substrate holder and ground electrodes,
which generates an RF potential by virtue of the flow
of RF current through it. Adjustment of the RF
potential of the substrate results in a controlled d-c
bias potential developed at the film surface, which
correlates directly with the physical properties of the
deposited films. In general, the most desirable film
properties are obtained when the d-c substrate bias
(obtained by adjusting the substrate-holder RF
impedance) is at a high negative potential. The effect
of substrate bias on etch rate, pinhole breakup
thickness, and argon content has been measured.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6800 (Surfaces and interfaces; thin films and
whiskers); B0500 (Materials science for electrical and
electronic engineering); B2830 (Insulation and
insulating coatings); B7310J (Impedance and admittance
measurement); C3110J (Impedance and admittance
control); C3355Z (Control applications in other
manufacturing processes)",
corpsource = "IBM Components Div. Lab., Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric variables control; films; films, dielectric;
IBMJA; ionization; manufacturing processes; plasmas;
preparation; radio equipment, manufacture; radio
frequency sputtering; sputtering; thin films",
}
@Article{Maissel:1970:RSS,
author = "L. I. Maissel and R. E. Jones and C. L. Standley",
title = "Re-Emission of Sputtered {SiO}$_2$ During Growth and
its Relation to Film Quality",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "176--181",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:14 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An improved technique for measuring re-emission
coefficients is described and data on the effect of
temperature are presented. These are discussed in the
light of a physical model of film growth during
sputtering wherein constant re-emission of material
throughout deposition occurs. Evidence is then
presented that such re-emission is essential if films
of high quality are to be obtained. To help assess
`quality' in a quantitative fashion, use has been made
of the PBUT (pin-hole-breakup thickness) phenomenon,
which is described in some detail. The influence on
PBUT of several system parameters such as sputtering
pressure and impurity content is discussed and related
to the re-emission coefficient.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180 (Radiation damage and other irradiation
effects); A6870 (Whiskers and dendrites: growth,
structure, and nonelectronic properties); B2830E
(Inorganic insulation)",
corpsource = "IBM Components Div. Lab., E. Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "films; films, dielectric; films, electric properties;
IBMJA; insulating materials; N E; plasmas; preparation;
radio equipment, manufacture; silicon compounds;
sputtering; thin films",
}
@Article{Logan:1970:MEC,
author = "J. S. Logan and F. S. Maddocks and P. D. Davidse",
title = "Metal Edge Coverage and Control of Charge Accumulation
in {RF} Sputtered Insulators",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "182--191",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The successful application of RF sputtered SiO$_2$ in
the passivation of silicon semiconductor devices
depends in part on the proper control of ionic charge
migration in the insulator during sputtering, and on
the adequate coverage of metal line edges by the
insulator. It is shown that an appropriate combination
of target purity, substrate temperature control and
phosphosilicate blocking layer thickness can be used to
achieve ionic charge densities at the silicon-SiO$_2$
interface of less than 1x10//1$_2$ charges per sq cm.
The effects of argon ion bombardment are shown to be
acceptably low for typical operating conditions. In a
conventional system, the adequate coverage of metal
line edges is shown to be influenced primarily by argon
pressure and magnetic field. In a special system where
the substrate potential can be varied, it has been
shown that adequate edge coverage can be obtained at
sufficiently negative potentials. These data are
consistent with a mechanism requiring some resputtering
to obtain the desired film coverage.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6870 (Whiskers and dendrites: growth, structure, and
nonelectronic properties); A7700 (Dielectric properties
and materials); B2830 (Insulation and insulating
coatings)",
corpsource = "IBM Components Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "films; films, dielectric; films, electric properties;
IBMJA; insulating coatings; plasmas; preparation; radio
equipment, manufacture; silicon compounds; thin films",
}
@Article{Mazza:1970:AIM,
author = "N. M. Mazza",
title = "Automatic Impedance Matching System for {RF}
Sputtering",
journal = j-IBM-JRD,
volume = "14",
number = "2",
pages = "192--193",
month = mar,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:16 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A matching network transforms the complex impedance of
a sputtering system to a purely resistive value. A
method is given for preventing increases in the
reflected power as the impedance in the sputtering
system changes. After starting with the sputtering
system properly matched and operating, the capacitors
in the matching network are adjusted to obtain
representative combinations of capacitance that are
near the `matched values'. A block diagram of the
entire matching system is shown. The automatic matching
system has, by eliminating a troublesome variable,
proved useful in the improvement of the overall RF
sputtering process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0500 (Materials science for electrical and electronic
engineering); C3355Z (Control applications in other
manufacturing processes)",
corpsource = "IBM Components Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "discharges (electric); films, preparation; IBMJA;
manufacture; manufacturing processes; radio circuits;
radio equipment; radio frequency sputtering;
sputtering",
}
@Article{Methfessel:1970:SFM,
author = "S. Methfessel",
title = "Survey of the Field of Magnetic Semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "207--213",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Magnetic semiconductors are materials with good band
conductivity as well as magnetic order. Since each
phenomenon requires a different description of the
relevant electron states, the band structure of these
materials is very complicated, containing band states
as well as localized states. An important condition for
strong interaction between the magnetic and the
conducting electrons appears to be the existence of
high densities of states at the Fermi energy, providing
large carrier polarizations in the magnetized state.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7000 (Condensed matter: electronic structure,
electrical, magnetic, and optical properties); A7220
(Electrical conductivity phenomena in semiconductors
and insulators); B2550 (Semiconductor device
technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Ruhr-Univ., Bochum, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "band structure; IBMJA; impurity electron states and
effects; magnetisation; magnetisation state; magnetism;
materials; physics; reviews; RON; semiconductor;
semiconductors; solid state",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Kasuya:1970:EME,
author = "T. Kasuya",
title = "Exchange Mechanisms in Europium Chalcogenides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "214--223",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Superexchange mechanisms, which are mostly responsible
for the nnn exchange constant I$_2$ in Eu
chalcogenides, are investigated in detail. In contrast
with the usual 3d transition metal compounds, the
Kramers-Anderson mechanism is estimated to be one order
of magnitude too small to explain the experimental
results. The mechanism by which a p electron is
transferred to a 5d state through the d-f exchange
interaction gives the correct order f magnitude for
I$_2$, with a negative sign, even though it is a
sixth-order perturbation. The cross term between the
above two mechanisms is shown to be nearly as important
as the second mechanism and may have a positive sign.
The indirect exchange mechanisms, in which the anion p
level has no important role, are responsible for the nn
exchange constant I$_1$. The phonon-assisted mechanism
proposed by J. Smit is estimated to be more than one
order of magnitude smaller than the experimental value.
The d-f mixing term is proved to be responsible for
I$_1$, in good agreement with experiment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7510 (General theory and models of magnetic
ordering); A7530E (Exchange and superexchange
interactions in magnetically ordered materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "europium compounds; exchange interactions (electron);
IBMJA; magnetism; physics; rare earth compounds; solid
state",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Kuznietz:1970:LMI,
author = "M. Kuznietz",
title = "Long-Range Magnetic Interactions ({RKKY}-Type) in the
{UP-US} Solid Solutions",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "224--226",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A neutron diffraction study of the UP-US solid
solutions has revealed two new magnetic structures, the
type IA (2U, 2-) antiferromagnetic structure and the
antiphase (5U, 4-) ferrimagnetic structure, which are
of long range (several lattice parameters) and are
typical of long-range RKKY-type interactions, as
assumed in the simple model for these compounds.
Further experimental evidence is given for the
long-range magnetic interactions in uranium
monopnictides and monochalcogenides and their solid
solutions. The situation in these uranium compounds is
compared with the corresponding lanthanide compounds,
and the role of covalency and superexchange in the case
of heavier anions is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7530E (Exchange and superexchange interactions in
magnetically ordered materials); A7550E
(Antiferromagnetics)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Argonne Nat. Lab., IL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "exchange interactions (electron); IBMJA; magnetic
properties of; magnetism; physics; solid state;
substances; uranium compounds",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Hastings:1970:OMN,
author = "J. M. Hastings and L. M. Corliss",
title = "Ordered Moment of {NiS}$_2$",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "227--228",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The transition metal dichalcogenides exhibit a wide
variety of both electrical and magnetic properties,
from insulators to superconductors and from
ferromagnetism through antiferromagnetism to
diamagnetism. NiS$_2$ is a semiconductor with an
anomalous paramagnetic behavior which leaves in doubt
the existence of a local moment. Previous neutron
diffraction data have failed to show any ordering down
to 4.2 K. Neutron powder diffraction data on
stoichiometric NiS$_2$ are presented which show a
transition at 40 K to a structure which can be
described as ordering of the first kind. This is
followed by an abrupt transition at 30 K in which
additional diffraction peaks appear and these are
consistent with ordering of the second kind. Despite
the fact that the powder data cannot indicate an
unambiguous magnetic structure, the magnitude of the
ordered moment can be fixed. The rms moments associated
with ordering of the first and second kinds are given,
as is the total moment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7500 (Magnetic properties and materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "IBMJA; magnetic properties of substances; magnetic
transitions of; magnetism; neutron diffraction
examination of materials; nickel compounds; physics;
rd; solid state; substances",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Mathur:1970:SHS,
author = "M. P. Mathur and D. W. Deis and C. K. Jones and A.
Patterson and W. J. {Carr, Jr.}",
title = "Specific Heat of {SnTe-MnTe} System from $2$ to
$25^{\circ}{K}$",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "229--231",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The low-temperature specific heat of a series of
semiconductor alloys of the SnTe-MnTe system, for Mn to
Sn ratios of 0 to 0.1, has been measured in the
temperature range 2 to 25 K. Large anomalies are
observed due, presumably, to the ordering of the Mn
spin system. The temperature region over which these
anomalies occur is roughly the region in which
ferromagnetism is observed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6540 (Heat capacities of solids)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Westinghouse Res. Labs., Pittsburgh, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "Al; HEV; IBMJA; magnetic properties; magnetisation
state; manganese compounds; materials; physics, solid
state; semiconductor; semiconductors; semiconductors,
manganese comp; semiconductors, tellurium comp;
specific heat of solids; tin compounds",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Honig:1970:LIE,
author = "J. M. Honig",
title = "Localized and Itinerant Electrons in Oxides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "232--244",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recent work concerning the electrical properties of
ReO$_3$, nonstoichiometric praseodymia, TiO$_2$,
SrTiO$_3$, perovskites, CrO$_2$, NiO, mixed oxides of
LiZnV, V$_2$O$_3$, and Ti$_2$O$_3$ has been selectively
reviewed in attempts to elucidate the conduction
properties of the charge carriers. A number of
controversial issues are pointed out-frequently it is
not known whether mobilities are activated or not, nor
whether a given material should be classified as a
polaronic or mixed-carrier material; neither is there
agreement on the nature of electrical transitions.
Reasons for discrepancies in electrical properties are
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7210D (Carrier scattering by phonons, magnons, and
other nonlocalized excitations)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Purdue Univ., West Lafayette, IN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electrical conductivity of solids; IBMJA; oxygen
compounds; physics; RES; reviews; solid state",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Siemons:1970:HMM,
author = "W. J. Siemons",
title = "Hall Mobility Measurements on Magnetite Above and
Below the Electronic Ordering Temperature",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "245--247",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Hall effect measurements were made on a single crystal
of magnetite in the temperature range 65 to 373 K. The
Hall voltage was positive over the whole temperature
range. The results can be explained by assuming that
magnetite is a normal semiconductor below the
transition point and a degenerate one above that
temperature.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220M (Galvanomagnetic and other magnetotransport
effects (semiconductors/insulators)); A7280
(Conductivity of specific semiconductors and
insulators); A7560E (Magnetization curves, hysteresis,
Barkhausen and related effects); B2550 (Semiconductor
device technology); B3110 (Magnetic materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "E. I. du Pont de Nemours Co., Wilmington, DE, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric properties; electrical conductivity of
solids; Hall effect; IBMJA; iron oxide; magnetic;
magnetisation state; materials; physics, solid state;
semiconductor materials; semiconductors; WO",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Nicolau:1970:TPI,
author = "P. Nicolau and I. Bunget and M. Rosenberg and I.
Belciu",
title = "Transport Properties of Iron-Nickel Ferrites",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "248--250",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The mechanism of electrical conduction in iron-nickel
ferrites was investigated. The electrical properties of
these compounds are extremely sensitive to the presence
of alpha-Fe$_2$O$_3$ as a second phase. The exponential
temperature dependence of the electrical resistivity
and the temperature-independent thermoelectric power
are in good agreement with an electron-hopping model.
The electrical conduction occurs by thermally activated
electron hopping between octahedral ferrous and ferric
ions with an activation energy q. The values of
resistivity, q and thermoelectric power depend on the
ferrous ion concentration only, and are not sensitive
to small deviations from stiochiometry due to the
presence of cation or anion vacancies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); A7550G
(Ferrimagnetics); B2550 (Semiconductor device
technology); B3110E (Ferrites and garnets)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Univ. Bucharest, Romania",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric properties; electrical conductivity;
electrical conductivity of solids; ferrites; IBMJA;
magnetic materials, ferrites; nickel compounds;
physics, solid state; semiconductor materials;
semiconductors",
sponsororg = "American Phys. Soc.; IBM Corp",
xxauthor = "P. Nicollau and I. Bunget and M. Rosenberg and I.
Belciu",
}
@Article{Rice:1970:MTT,
author = "T. M. Rice and D. B. McWhan",
title = "Metal-Insulator Transition in Transition Metal
Oxides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "251--257",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The metal-insulator transition in the V$_2$O$_3$
system is discussed. A recent series of experiments on
V$_2$O$_3$ and Cr-doped V$_2$O$_3$ is reviewed. The
phase diagram for the system is described. The Cr-doped
mixed oxides are insulating at room temperature and
transform to a metal with the application of pressure.
This phase transition is identified as a N. F. Mott
transition. A comparison is made between the
experimental results and theoretical predictions of the
Mott transition.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electrical conductivity; electrical conductivity of
solids; IBMJA; physics; semiconductor materials;
semiconductors, electric properties; solid state;
vanadium compounds",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Matsumoto:1970:MEP,
author = "G. Matsumoto",
title = "Magnetic and electrical properties of
{(La$_{1-x}$Ca$_x$)MnO$_3$}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "258--260",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Samples of polycrystalline Ca-doped LaMnO$_3$ with
varying proportions of Ca were studied experimentally.
Data were obtained for the Neel temperature,
paramagnetic Curie temperature, and NMR spectra
associated with Mn ions. All the experimental results
could be qualitatively explained by postulating that
the d holes at the sites around Ca ions contribute to
both the electrical conduction and the magnetic
interaction. The ferromagnetic interaction induced by
mobile d holes cannot be ascribed to the
double-exchange interaction, if this interaction has
the usual form.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); A7530K
(Magnetic phase boundaries)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Univ. Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electrical conductivity; electrical conductivity of
solids; IBMJA; lanthanum compounds; magnetic materials;
magnetic properties; magnetic relaxation; magnetic
transitions of; materials; NCr; nuclear magnetic
resonance; of substances; physics; semiconductor;
semiconductors, electric properties; semiconductors,
magnetic properties; semiconductors, manganese comp;
substances",
sponsororg = "American Phys. Soc.; IBM Corp",
xxtitle = "Magnetic and Electrical Properties of {Ca}-Doped
{LaMnO}$_3$",
}
@Article{Adler:1970:BSM,
author = "D. Adler",
title = "Band Structure of Magnetic Semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "261--268",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The band structure of materials in which both
localized and itinerant outer electrons are
simultaneously present is discussed. The Franck-Condon
principle is applied, and small and large polaron
formation is taken into account. A scheme for
estimating the densities-of-states of perfect crystals
and doped or nonstoichiometric crystals is suggested,
based on the ionic many-body states as a starting
point. Screening, covalency, crystalline-field and
overlap effects are quantitatively considered. In
particular, the band structures of both pure and
Li-doped NiO are derived and found to be in agreement
with the experimental observations. It is shown that
conclusions which are based on ordinary donor and
acceptor techniques fail to account for the effects of
doping even in a qualitatively correct manner, due to
the neglect of important correlation effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "MIT., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "band structure; IBMJA; magnetic properties; nickel
compounds; physics, solid state; semiconductor
materials",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{vonMolnar:1970:TPE,
author = "S. {Von Molnar}",
title = "Transport Properties of the Europium Chalcogenides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "269--275",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Transport properties of pure and doped Eu
chalcogenides are reviewed to determine the mechanisms
responsible for the anomalous behavior near the Curie
temperature. It is found that, whereas the scattering
theory of simple metals accounts for the behavior of
materials containing impurities in excess of
2x10$^{20}$cm-$_3$, several models for transport have
been proposed for smaller concentrations. The impurity
hopping model appears to be consistent with the data
for very dilute systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); A7560E
(Magnetization curves, hysteresis, Barkhausen and
related effects); B2550 (Semiconductor device
technology); B3110 (Magnetic materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric properties; electrical conductivity of
solids; europium compounds; IBMJA; impurity electron
states and effects; magnetic materials; magnetic
transitions of substances; physics, solid state;
semiconductor materials; semiconductors",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Oliver:1970:TMF,
author = "M. R. Oliver and J. O. Dimmock and T. B. Reed",
title = "Temperature and Magnetic Field Dependence of the
Conductivity of {EuO}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "276--278",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The conductivity of EuO has been measured as a
function of temperature from 30 to 300 K in magnetic
fields up to 50 kG. The zero-field resistivity exhibits
a sharp elbow at about 50 K, and increases as much as
$10^8$ between 50 and 70 K to a broad maximum between
75 and 80 K. In an applied magnetic field, the broad
maximum is rapidly decreased the elbow is shifted to
higher temperatures. These data are interpreted in
terms of a transfer of electrons between a conduction
band and an electron trap. In the model the energy
separation between the band and trap level depends on
the magnetic energy of the crystal and is thus a strong
function of temperature and magnetic field. At low
temperatures the trap level is assumed to be above the
conduction band edge such that the electrons lie in the
band. As the temperature is increased the energy of the
band edge increases such that it crosses the trap level
at about 50 K. The large increase in resistivity with
increasing temperature and the effects due to the
magnetic field are explained by the transfer of
electrons from the energy band into the trap states.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); B2550
(Semiconductor device technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "MIT., Lexington, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "BER; electric properties; electrical conductivity;
electrical conductivity of solids; europium compounds;
IBMJA; physics, solid state; semiconductor materials;
semiconductors",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Thompson:1970:TSF,
author = "W. A. Thompson and F. Holtzberg and S. {von Molnar}",
title = "Tunneling Spectroscopy in Ferromagnetic
Semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "279--281",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The observation of zero-bias anomalies in tunneling
has received much attention but their interpretation
has suffered from a lack of definition of the character
of the tunneling barrier. Junctions formed from a metal
with Eu-chalcogenide ferromagnetic semiconductors offer
a potential means of overcoming this difficulty.
Rectifying junctions of EuS\slash Eu on In were
prepared. The results indicate a large resistivity peak
at zero-bias voltage which, in the ferromagnetic
region, has a strong magnetic-field dependence, and a
resistance maximum near 30 mv which has been
tentatively assigned to excitation of collective modes
in the bulk of the semiconductor. The results are
interpreted by considering excitation of ferromagnetic
magnons in the barrier region.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7560E (Magnetization
curves, hysteresis, Barkhausen and related effects);
B2560H (Junction and barrier diodes); B3110C
(Ferromagnetic materials); B3110 (Magnetic materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "ATA; dielectric phenomena; electric properties;
electrical conductivity of solids; europium compounds;
ferromagnetic properties of substances; IBMJA; magnetic
materials; materials; physics, solid state;
semiconductor; semiconductor junctions; tunnelling",
sponsororg = "American Phys. Soc.; IBM Corp",
xxtitle = "Tunnelling spectroscopy in ferromagnetic
semiconductors",
}
@Article{Haas:1970:SSB,
author = "C. Haas",
title = "Spin-disorder scattering and band structure of the
ferromagnetic chalcogenide spinels",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "282--288",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Magnetic semiconductors are characterized by the
presence of charge carriers and magnetic moments. The
interaction between the charge carriers and the
magnetic moments leads to a spin splitting of the
energy bands, and to spin-disorder scattering of the
scattering of the charge carriers. The result is a
strong influence of magnetic properties on the
transport properties. The theory of these effects is
discussed, and two models for the band structure of
CdCr$_2$Se$_4$ are discussed, and compared with
experimental data on the optical properties and the
transport properties.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); A7510 (General
theory and models of magnetic ordering); B2550
(Semiconductor device technology); B3110C
(Ferromagnetic materials); B3110 (Magnetic materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "State Univ., Groningen, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "band structure; cadmium compounds; electrical
conductivity; ferromagnetic properties of substances;
IBMJA; magnetic; materials; of solids; physics;
semiconductor materials; semiconductors, electric
properties.; semiconductors, intermetallic;
semiconductors, magnetic; solid state",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Friedman:1970:HEB,
author = "L. R. Friedman and A. Amith",
title = "Hole and electron bands in $n$-type {CdCr$_2$\slash
Se$_4$}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "289--291",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B2550 (Semiconductor
device technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "RCA, Princeton, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "band structure; cadmium compounds; semiconductor
materials",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Vural:1970:HFN,
author = "B. Vural",
title = "High-field nonohmic behavior of the $p$-type
ferromagnetic semiconductor {Ag$_x$\slash
Cd$_{1-x}$\slash Cr$_2$\slash Se$_4$}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "292--294",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:21 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The high-field longitudinal magnetoresistance of the
ferromagnetic (polycrystalline) p-type semiconductor
CdCr$_2$Se$_4$ doped with 1\% Ag has been measured as a
function of temperature and applied magnetic and
electric fields. It is suggested that the observed
`anomalies' may be related to the possible spin
wavecarrier wave interactions in these materials.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220M (Galvanomagnetic and other magnetotransport
effects (semiconductors/insulators)); A7280
(Conductivity of specific semiconductors and
insulators); A7560E (Magnetization curves, hysteresis,
Barkhausen and related effects); B2550 (Semiconductor
device technology); B3110C (Ferromagnetic materials);
B3110 (Magnetic materials)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "The City Coll. City Univ., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric properties; ferromagnetic properties of
substances; IBMJA; magnetic materials; magnetoelectric
effects; magnetoresistance; materials; pes; physics,
solid state; semiconductor; semiconductors;
semiconductors, intermetallic; semiconductors, magnetic
properties",
sponsororg = "American Phys. Soc.; IBM Corp",
xxtitle = "High-Field Nonohmic Behavior of the {P}-Type
Ferromagnetic Semiconductor {Ag}-Doped
{CdCr}$_2${Se}$_4$",
}
@Article{Frederikse:1970:CET,
author = "H. P. R. Frederikse",
title = "Comments on Electronic Transport in Transition Metal
Oxides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "295--300",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Several aspects of electronic transport in nonmagnetic
and magnetic transition metal oxides are reviewed.
These include high-and low-temperature measurements of
conductivity, the Hall effect and the Seebeck effects,
and their analysis in terms of the electronic energy
structure. Particular emphasis is put on the
temperature dependence of the Hall mobility, which
gives essential information concerning the correct
description of the energy states and the scattering of
the charge carriers. The relation between the transport
properties and the magnetic ordering is discussed. The
properties of LaCoO$_3$, together with an
interpretation suggested by J. B. Goodenough are
presented to illustrate this point.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220M (Galvanomagnetic and other magnetotransport
effects (semiconductors/insulators)); A7280
(Conductivity of specific semiconductors and
insulators); B2550 (Semiconductor device technology)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "Nat. Bur. Stand., Washington, DC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "electric properties; electrical conductivity;
electrical conductivity of solids; electron mobility;
Hall effect; IBMJA; materials; physics, solid state; R
W; reviews; semiconductor; semiconductors;
semiconductors, intermetallic",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Dimmock:1970:OPE,
author = "J. O. Dimmock",
title = "Optical Properties of the Europium Chalcogenides",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "301--308",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The measured optical properties of the Eu
chalcogenides are surveyed in an attempt to determine
those aspects of the electronic structure of these
materials that have been established. Optical
absorption as well as optical and magneto-optical
reflectivity data are discussed, along with the results
of photoconductivity, photoluminescence and
photoemission measurements and of magneto-optical
measurements in the vicinity of the absorption edge.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7800 (Optical properties and condensed matter
spectroscopy and other interactions of matter with
particles and radiation)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
corpsource = "M.I.T., Lexington, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "absorption; band structure; europium compounds;
excitons; IBMJA; light; luminescence of inorganic
solids; magneto-; optical effects; optical properties;
optics; photoconductivity; physics, solid state;
reflectivity; reviews; semiconductor materials;
semiconductors; spectra of inorganic solids",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Pidgeon:1970:ORS,
author = "C. R. Pidgeon and J. Feinleib and W. J. Scouler and J.
O. Dimmock and T. B. Reed",
title = "Optical Reflectance Study of Magnetic Ordering Effects
in {EuO}, {EuS}, {EuSe} and {EuTe}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "309--311",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:29:09 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The reflectivity of the ferromagnetic semiconductors
EuO, EuS and EuSe has been measured as a function of
temperature and light polarization in an orienting
magnetic field. In the energy range from just above the
absorption edges to about 5.0 eV, there are two
prominent features, E$_1$ and E$_2$, which change with
the magnetic order, indicating exchange splittings of
the 5d states. Antiferromagnetic EuTe shows a different
structure in the E$_1$ and E$_2$ peaks. However, with a
large magnetic field applied, greater than 40 koe, the
spectrum becomes characteristic of the other
ferromagnetic europium chalcogenides suggesting a phase
transition to parallel spin alignment at a magnetic
field of approximately 80 koe. The effect provides
direct experimental confirmation of the band theory
prediction that there are superlattice splittings in
the band structure of an antiferromagnetic crystal.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7525 (Spin arrangements in magnetically ordered
materials); A7800 (Optical properties and condensed
matter spectroscopy and other interactions of matter
with particles and radiation)",
corpsource = "M.I.T., Lexington, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "band structure; crystals, structure; EuO; europium
compounds; ferromagnetic properties; IBMJA; magnetic
properties; of substances; physics, solid state;
reflectivity; semiconductor materials; semiconductors,
optical proper; spectra of inorganic solids",
}
@Article{Wittekoek:1970:MIB,
author = "S. Wittekoek and P. F. Bongers",
title = "Magneto-Optical Investigation of the Band Edge of
{CdCr}$_2${S}$_4$ and Related Absorption Measurements
on {Cr}-Doped {CdIn}$_2${S}$_4$",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "312--314",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The T$_1$ and T$_2$ crystal-field transitions of
trivalent Cr have been observed in the absorption
spectrum of CdIn$_2$S$_4$ (Cr). From the similarity
between the temperature dependence of the T$_2$ band
and the reported blue shift of the absorption edge of
CdCr$_2$S$_4$ it is concluded that in CdCr$_2$S$_4$
this edge is caused by the T$_2$ absorption band of the
chromic ions. The polar magneto-optic Kerr effect
between 560 and 700 nm and the Faraday rotation between
800 and 8000 nm are reported for CdCr$_2$S$_4$. The
Kerr effect spectrum indicates that the intrinsic band
edge of CdCr$_2$S$_4$ is at 1.91 e V at 60 K and shifts
to lower energies with decreasing temperature.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7800 (Optical properties and condensed matter
spectroscopy and other interactions of matter with
particles and radiation); A7820L (Magneto-optical
effects (condensed matter))",
corpsource = "Philips Res. Labs., Eindhoven, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "cadmium compounds; effects; IBMJA; light absorption;
magneto-optical; optical properties; semiconductor
materials; semiconductors; solids; spectra of
inorganic",
}
@Article{Kuse:1970:IMO,
author = "D. Kuse",
title = "Influence of Magnetic Ordering on the {Faraday} Effect
in {CdCr}$_2${Se}$_4$",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "315--317",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements of the magnetooptical rotation in
CdCr$_2$Se$_4$ at wavelengths between 0.9 and 1.3 $\mu$
m are reported. In the paramagnetic state, the rotation
passes a minimum with decreasing wavelength and changes
sign at the absorption edge. The Verdet constant is
proportional to the paramagnetic susceptibility (V
equals -18 deg/K Oe-cm at 300 K and the wavelength
equals 1.05 $\mu$ m). In the ferromagnetic state the
Faraday effect is large and the sign reversal very
pronounced; e.g., the rotation changes by 6500
deg\slash cm in a wavelength interval of 400 A in
saturated material at 93 K. The photon energy at which
the sign reversal occurs shows a strong
temperature-dependent red shift; the temperature
dependence is similar to that of the absorption edge.
At low temperatures an additional rotational minimum
appears that is subject to the same red shift.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7520 (Diamagnetism and paramagnetism); A7560E
(Magnetization curves, hysteresis, Barkhausen and
related effects); A7820L (Magneto-optical effects
(condensed matter))",
corpsource = "Brown Boveri Res. Center, Baden, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "cadmium compounds; ferromagnetic properties of
substances; IBMJA; magneto-optical effects; optical
properties; paramagnetic properties of; physics, solid
state; semiconductor materials; semiconductors;
semiconductors, intermetallic; semiconductors, magnetic
properties; substances",
}
@Article{White:1970:MFD,
author = "R. M. White",
title = "Magnetic Field Dependence of Indirect Transitions in
Ferromagnetic Semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "318--320",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The optical absorption coefficient for magnetic
semiconductors has been calculated for indirect
transitions in which the intraband scattering arises
from an s-d or s-f exchange interaction instead of the
usual phonon mechanism. The temperature and magnetic
field dependence of the resulting absorption
coefficient are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7530E (Exchange and
superexchange interactions in magnetically ordered
materials); A7560E (Magnetization curves, hysteresis,
Barkhausen and related effects); A7800 (Optical
properties and condensed matter spectroscopy and other
interactions of matter with particles and radiation)",
corpsource = "Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "exchange interactions (electron); ferromagnetic
properties; IBMJA; light absorption; magnetisation
state; of substances; optical properties; physics,
solid state; semiconductor materials; spectra of
inorganic solids",
}
@Article{Gyorgy:1970:PME,
author = "E. M. Gyorgy and J. F. {Dillon, Jr.} and J. P.
Remeika",
title = "Photoinduced magnetic effects in {YIG(Si)}",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "321--329",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recent investigations of photoinduced effects in
magnetic materials are summarized. To date it has been
shown that the uniaxial anisotropy strain, linear
dichroism, coercive force and initial permeability can
be modified by infrared radiation. The theory
interpreting the coercive force and permeability
experiments differs from the model used to describe the
first three effects and is not discussed here. The
first three effects can be interpreted fairly well in
terms of a model which has single ferrous ions
preferentially occupying inequivalent octahedral sites.
It is shown that with polarized light, more than half
of the available ferrous ions can be selectively moved
among specific types of sites. Irradiation with
unpolarized light essentially leads to a distribution
appropriate for thermal equilibrium at the temperature
of the sample.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7240 (Photoconduction and photovoltaic effects;
photodielectric effects); A7560E (Magnetization curves,
hysteresis, Barkhausen and related effects)",
corpsource = "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "ferromagnetic properties of substances; garnets;
magnetic; photoelectromagnetic effects; yttrium
compounds",
}
@Article{Kobayashi:1970:CSR,
author = "H. Kobayashi",
title = "Coding Schemes for Reduction of Intersymbol
Interference in Data Transmission Systems",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "343--353",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Various coding schemes and their effects on
intersymbol interference in pulse amplitude modulation
systems are discussed. First, the relation between
imperfections in the baseband-equivalent channel and
intersymbol interference is clarified and applied to
explain the effect of correlative level coding and
Gorog's frequency concept codes in reducing intersymbol
interference. Another coding scheme is then introduced;
construction of codes in the time domain with
intersymbol interference directly in mind. A decimal
code of length 4 and a alphanumeric code of length 6
are proposed as practical codes and their properties
are discussed. Simulation results are presented to give
quantitative comparison of these coding techniques.
Curves of the vertical eye-opening vs transmission rate
have been produced and it is shown that codes designed
in the time domain achieve better performance than both
the frequency concept codes and the conventional codes
for a wide class of channel characteristics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6210L (Computer communications);
C6130 (Data handling techniques)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; communication channels; data communication
systems; data transmission; IBMJA; information theory;
interference; intersymbol interference; pulse-code
modulation; systems; transmission codes",
}
@Article{Croisier:1970:IPT,
author = "A. Croisier",
title = "Introduction to Pseudoternary Transmission Codes",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "354--367",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Many of the pseudoternary (PT) codes (twinned,
bipolar, partial response, etc.) used in data
transmission are described, with emphasis on their
spectral (or, more generally, statistical) properties.
Linear and nonlinear PT codes are considered, the
latter being divided into alphabetic and nonalphabetic
codes. Among the nonalphabetic codes, emphasis is given
to the modified bipolar codes used in pulse code
modulation systems. Two recently developed codes of
this type are described-\% High Density Bipolar (HDB)
and Compatible High Density Bipolar(CHDB). They are
particularly suitable for PCM transmission on repeater
lines. Another nonalphabetic code, the Transparent
Interleaved Bipolar (TIB) is presented for the first
time. This code features all the advantages of
partial-response (or Interleaved Bipolar) signalling
and, in addition, guarantees a minimum density of
pulses, regardless of the data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding; data communication systems; data
transmission systems; IBMJA; information theory;
pseudoternary codes; pulse code modulation; radio
transmission; telephone, data transmission",
}
@Article{Kobayashi:1970:APC,
author = "H. Kobayashi and D. T. Tang",
title = "Application of partial-response channel coding to
magnetic recording systems",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "368--375",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B6450D (Audio
recording media and techniques); C1260 (Information
theory); C5310 (Storage system design); C6130 (Data
handling techniques)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "audio recording; channel capacity; codes; magnetic
storage; signal processing; systems",
}
@Article{Franaszek:1970:SSM,
author = "P. A. Franaszek",
title = "Sequence-State Methods for Run-Length-Limited Coding",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "376--383",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.15",
MRnumber = "42 \#4313",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Methods are presented for the encoding of information
into binary sequences in which the number of zeros
occurring between each pair of successive ones has both
an upper and a lower bound. The approach taken is based
on the use of finite-state machines as models of the
run-length-limited sequence constraints. Algorithms
presented in a recent report are used to construct
synchronous (fixed-rate) codes that are optimal in the
sense that the maximum word length is minimized for a
given bit-per-symbol value. Word lengths of fixed-and
of variable-length codes in this class are compiled for
a number of (d,k) constraints. The results indicate
that varying the word length frequently yields codes
that are shorter and easier to implement. The problem
of error propagation, which arises in state-dependent
and variable-length coding, is studied. It is shown
that one can always limit error propagation in
fixed-length (d,k) codes by a proper assignment of
message digits to code words. A method for constructing
error-propagation-limiting, variable-length (d,k) codes
is described, the method being valid for the more
general case of constrained sequences with finite
memory. Some examples of code construction are included
to illustrate the methods.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); C1260
(Information theory); C6130 (Data handling
techniques)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "binary sequences; codes; data transmission;
finite-state machines; IBMJA; information theory;
processing; sequential circuits; signal",
}
@Article{Brown:1970:ECI,
author = "D. T. Brown and F. F. {Sellers, Jr.}",
title = "Error Correction for {IBM} 800-Bit-Per-Inch Magnetic
Tape",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "384--389",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The 800-bit-per-inch magnetic tape units that are
components of IBM System\slash 360 can correct error
bursts of unlimited length in any one of their nine
tape tracks. The correction technique employs a
modified cyclic code in conjunction with a parity bit
in each nine-bit character. There are nine check bits
in the modified cyclic code and these form a check
character at the end of every record. To perform the
correction, a record in which an error has been
detected must be reread. Errors involving more than one
track within the same record are detected but are not
correctable. This error correction technique operates
during both read-forward and read-backward operations,
and on records of any length.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); C1260
(Information theory); C5320C (Storage on moving
magnetic media); C6130 (Data handling techniques)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding; computers, errors; cyclic codes; error
compensation; error correction codes; IBMJA;
information theory; magnetic; magnetic tape; magnetic
tape storage; storage devices",
}
@Article{Hsiao:1970:OLS,
author = "M. Y. Hsiao and D. C. Bossen and R. T. Chien",
title = "Orthogonal {Latin} Square Codes",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "390--394",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.15",
MRnumber = "43 \#4548",
bibdate = "Tue Mar 06 15:32:24 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new class of multiple-error correcting codes has
been developed. Since it belongs to the class of
one-step-decodable majority codes, it can be decoded at
an exceptionally high speed. This class of codes is
derived from a set of mutually orthogonal Latin
squares. This mutually orthogonal property provides a
class of codes having a unique feature of `modularity'
The parity check matrix possesses a uniform pattern and
results in a small number of inputs to modulo 2 adders.
This class of codes has m**2 data bits, where m is an
integer, and 2tm check bits for t-error correcting.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding; error correction codes;
error-correcting codes; IBMJA; information theory",
reviewer = "N. J. A. Sloane",
}
@Article{Hsiao:1970:COM,
author = "M. Y. Hsiao",
title = "Class of Optimal Minimum Odd-Weight-Column {SEC-DED}
Codes",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "395--401",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The class of codes described is used for single-error
correction and double-error detection (SEC-DED). It is
equivalent to the Hamming SEC-DED code in the sense
that for a specified number k of data bits, the same
number of check bits r is used. The minimum
odd-weight-column code is suitable for applications to
computer memories or parallel systems. A computation
indicates that this code is better in performance, cost
and reliability than are conventional Hamming SEC-DED
codes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding techniques; computers, digital;
computers, memories; error correction codes;
error-correcting codes; error-detection codes; IBMJA;
information theory",
}
@Article{Bossen:1970:BEC,
author = "D. C. Bossen",
title = "{B}-Adjacent Error Correction",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "402--408",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A high-speed method is derived for single-symbol error
correcting Reed, Solomon and Hamming type codes. A
matrix description is used for implementation of the
codes, in which single-error correction in the Galois
field 2b corresponds to correcting a block of b bits in
a binary field. The resulting codes correct not only
single-bit errors but also single clusters of
b-adjacent-bit errors. This method, being a hardware
technique, has the time for correction measured in
terms of a few logic levels rather than in terms of a
few processor cycles.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; computers, digital; error correction codes;
error-correcting codes; IBMJA; information theory",
}
@Article{Bossen:1970:EC,
author = "D. C. Bossen",
title = "$b$-adjacent error correction",
journal = j-IBM-JRD,
volume = "14",
number = "??",
pages = "402--408",
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.15",
MRnumber = "43 \#3033",
bibdate = "Tue Sep 11 16:25:57 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "R. Alter",
}
@Article{Tang:1970:ECT,
author = "D. T. Tang and V. Y. Lum",
title = "Error Control for Terminals with Human Operators",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "409--416",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.10",
MRnumber = "42 \#4310",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The man-machine interface at any terminal in a
computer system is a likely source of error and can be
regarded as a noisy channel. Certain data, such as ID
numbers, can be precoded to protect against most-likely
errors, including transposition of adjacent symbols and
substitutions, as well as deletions and insertions.
Certain basic requirements for error detection with
minimum redundancy are considered. An efficient special
coding scheme designed for decimal terminals is
described next. Finally, certain cyclic codes are shown
to be adaptable to transposition error control when
appropriate decoding schemes are implemented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C1270 (Man-machine systems); C6130
(Data handling techniques)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; computers, codes; computers, digital; ed; error
correction codes; human engineering; IBMJA; man-machine
interfaces; man-machine systems; time sharing",
}
@Article{Savage:1970:TMD,
author = "J. E. Savage",
title = "Three Measures of Decoder Complexity",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "417--425",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.15",
MRnumber = "42 \#7399",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Three measures of the complexity of error correcting
decoders are considered, namely, logic complexity,
computation time and computational work (the number of
logic operations). Bounds on the complexity required
with each measure to decode with probability of error
Pe at code rate R are given and the complexity of a
number of ad hoc decoding procedures is examined.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "Brown Univ., Providence, RI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding; computers; error compensation; error
correction codes; error-correcting codes; IBMJA;
information theory",
reviewer = "G. M. Tenengol{\'c}",
}
@Article{Rocher:1970:AEH,
author = "E. Y. Rocher and R. L. Pickholtz",
title = "Analysis of the Effectiveness of Hybrid Transmission
Schemes",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "426--433",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A comparison is made of the performance of pure
retransmission, forward error correction, and hybrid
(error detecting\slash correcting) schemes for data
transmission in a noisy binary symmetric channel with a
probability of error greater than 10-**4. The
performance calculations are based on the use of BCH
codes for error detection and correction up to the full
correction capability of the code. It is shown that a
probability of undetected error of less than 10-**9
error\slash bit, can be achieved by correcting only a
few errors while retaining a reasonable throughput and
a very low retransmissionrate. The best codes in the
class considered are specified and the complexity of
instrumentation is estimated. Finally, various
combinations of possible systems employing half duplex
and reverse channel operation are used in a comparison
of the transmission schemes. For line error rate worse
than 10-**4 error\slash bit, a hybrid system operating
with a reverse channel is superior to the other
possibilities.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding error-correcting codes; communication
channels; computers, data transmission; data
transmission; data transmission systems; error
correction codes; error detection codes; hybrid
transmission schemes; IBMJA; IM",
}
@Article{Patel:1970:MGC,
author = "A. M. Patel",
title = "Maximal Group Codes with Specified Minimum Distance",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "434--443",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94.15",
MRnumber = "42 \#7395",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "All n-digit maximal block codes with a specified
minimum distance d such that 2d is equal to or greater
than n can be constructed from the Hadamard matrices.
These codes meet the Plotkin bound. The construction is
given for all maximal group codes in the region where
2d is equal to or greater than n, where d is a
specified minimum distance and n is the number of
digits per code word. Unlike the case of block codes,
the Plotkin upper limit, in general fails to determine
the number of code words B (n,d) in a maximal group
code in this region. It is shown that the value of B
(n,d) largely depends on the binary structure of the
number d. An algorithm is developed that determines
B(n,d), the maximum number of code words for given d
and n equal to or less than 2d. The maximal code is,
then, given by its modular representation, explicitly
in terms of certain binary coefficients and constants
related to n and d. As a side result, a new upper bound
is obtained on the number of code words in the region
where 2d is less than n which is, in general, stronger
than Ploktin's extended bound.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "codes; coding techniques; error-correcting codes;
IBMJA; information theory",
reviewer = "G. M. Tenengol\cprime c",
}
@Article{Jona:1970:LEE,
author = "F. Jona",
title = "Low Energy Electron Diffraction (Leed) Spectra
Aluminum",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "444--452, folding sheet",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The intensities of low energy electron beams
specularly and nonspecularly diffracted from (100),
(110) and (111) surfaces of aluminum have been measured
in a display-type LEED system as functions of electron
energy, angle of incidence and azimuthal angle. Several
of the measured and normalized spectra are presented,
and the procedures followed in aligning the sample,
reducing stray magnetic fields, and collecting and
normalizing the data are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6820 (Solid surface structure)",
corpsource = "State Univ. New York, Stony Brook, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "aluminium; aluminum metallography; crystals; electron
diffraction examination of materials; electron
diffraction spectra; IBMJA; ing; physics, solid state;
spectrum analysis; surface structure",
}
@Article{Dash:1970:SDS,
author = "S. Dash and M. L. Joshi",
title = "Silicon Defect Structure Induced by Arsenic Diffusion
and Subsequent Steam Oxidation",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "453--460",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Misfit dislocation nets are known to occur when very
high amounts of phosphorus and boron are diffused into
silicon single-crystal wafers. Diffusion of arsenic in
silicon is not known to produce such dislocations.
Through transmission electron microscopy it is shown
that diffusion of high amounts (up to 1.6x10**2**1
atoms\slash cm$^3$) of arsenic creates Frank hexagonal
loops on (111) planes parallel to the diffusion
surface, and stacking faults on the inclined (111)
planes, instead of misfit dislocation nets (the latter
are still not observed). These faults and loops are
found to be extrinsic, and are thought to be due to
insertion of extra silicon layers in the matrix where
the stacking fault energy is decreased by arsenic
atoms. The driving force for the generation of loops
and faults is shown to be the concentration gradient
rather than fast cooling.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170 (Defects in crystals); A6630 (Diffusion in
solids)",
corpsource = "Fairchild Semiconductor Res. and Dev. Lab., Palo Alto,
CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "arsenic; crystal defects; crystals, defects; diffusion
in solids; dislocations; IBMJA; oxidation; physics;
semiconductors, silicon; silicon; solid state",
}
@Article{Ames:1970:REA,
author = "I. Ames and F. M. D'Heurle and R. E. Horstmann",
title = "Reduction of Electromigration in Aluminum Films by
Copper Doping",
journal = j-IBM-JRD,
volume = "14",
number = "4",
pages = "461--463",
month = jul,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In accelerated life testing of thin-aluminum-film
conduction stripes, which are in widespread use in
planar semiconductor devices and integrated circuits,
it was found that the lifetime of aluminum films
subjected to high current densities at elevated
temperatures can be increased by the addition of
copper. Previous studies have indicated that the
failure mechanism is a combination of
electromigration-induced phenomena, including
nucleation and growth of voids, which are gated
primarily by material transport along grain boundaries.
On the basis of the present study, it appears that the
presence of copper causes an appreciable retardation in
the rate at which this overall combination of processes
takes place, thereby producing a considerable increase
in lifetime.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7215 (Electronic conduction in metals and alloys);
A7360 (Electronic properties of thin films); B2110
(Conductors)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "aluminium; conductivity of solids; copper; electric
conductors; electric conductors, testing; electrical;
electrical conductivity; IBMJA; metals; physics, solid
state; thick films; thin film conductors; thin films;
YST",
}
@Article{Goodman:1970:SEF,
author = "J. W. Goodman and A. M. Silvestri",
title = "Some Effects of {Fourier}-Domain Phase Quantization",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "478--484",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "By means of a biased limiter model, the effects of
Fourier-domain phase quantization are studied.
Amplitude information is assumed fully retained, while
phas is quantized to N equally spaced levels. The
recovered function is shown to consist of several
different contributions, the relative strengths of
which depend on the number of phase quantization
levels. Several specific examples are given. Motivation
and interpretation are presented in terms of digitally
constructed holograms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography); C4190 (Other
numerical methods)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "computers, graphics; Fourier analysis; Fourier
transforms; holography; IBMJA; image processing; light,
modulation; mathematics",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Patau:1970:IFU,
author = "J. C. Patau and L. B. Lesem and P. M. Hirsch and J. A.
{Jordan, Jr.}",
title = "Incoherent Filtering Using Kinoforms",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "485--491",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:28 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The kinoform is a computer-generated
wavefront-reconstruction device that may be thought of
as a complicated, computer-defined lens, whose surface
(for an off-axis point image) is analogous to that of
an accurately made blazed grating that diffracts light
into a single diffraction order. Incoherent optical
filtering with the kinoform used as a filtering element
is discussed. Kinoform theory is briefly reviewed and
initial results with `fan' and correlation filters are
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4280C (Spectral and other filters); B6140C (Optical
information, image and video signal processing); B7260
(Display technology and systems); C1250 (Pattern
recognition)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "IBM, Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "ATU; computers, graphics; filtering and prediction
theory; filters; IBMJA; image processing; optical
filters; optical images; optical information
processing; pattern; recognition; signal processing",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Milder:1970:AHC,
author = "D. M. Milder and W. H. Wells",
title = "Acoustic Holography with Crossed Linear Arrays",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "492--500",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An analysis is given of how acoustic (or microwave)
holography can be applied to large masses, such as
natural bodies of water or the earth, by means of a
linear array of microphones and by scanning with one or
more transmitters to produce holographic phase shifts.
This type of hologram, in which the phased array has a
conical antenna pattern, is shown to be superior to the
area hologram for computing images in the near field.
Computer simulations are given of virtual holograms and
image reconstructions for specular and diffuse
reflectors; simulations are also made for the case of
pulse holography.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4363 (Acoustic holography); A4385 (Acoustical
measurements and instrumentation); B4350 (Holography);
B7260 (Display technology and systems)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "acoustic imaging; acoustics; computers, graphics;
holography; IBMJA; image processing; light,
modulation",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Winthrop:1970:SSH,
author = "J. T. Winthrop",
title = "Structural-Information Storage in Holograms",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "501--508",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The number of degrees of freedom, or
structural-information content, of the object wave
field recorded in a Leith-Upatnieks hologram is
expressed in terms of the resolving power and
dimensions of the recording medium, the coherence
properties of the primary illumination and the position
of the point reference source. In contrast with
previous studies, the calculation does not involve the
paraxial approximation. It is shown that of all
holograms, the Fourier-transform hologram makes the
most efficient use of available resolving power and
coherence length.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography); C5320Z (Other
digital storage)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "holography; IBMJA; information theory; light,
modulation; optical information processing; ore",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Gabor:1970:LSE,
author = "D. Gabor",
title = "Laser Speckle and its Elimination",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "509--514",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:32:46 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The causes of `subjective' and `objective' speckle are
explained. Subjective speckle cannot be reduced except
by extending the aperture. The objective speckle in a
plane, for instance, in the plane of a transparency,
can be reduced, and in the limit made invisible, by a
special type of wide-angle illumination. This consists
of a one-parameter family of plane waves, which can be
produced by diffraction at a special grating, or two
crossed gratings, close to the object plane. This makes
it possible to produce multiple homograms, with the
same insensitivity to dust or scratches as diffused
holograms, but without any visible speckle in the
reconstruction.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "CBS Labs., Stamford, CT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "holography; IBMJA; laser speckle; lasers; light,
modulation",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Lorber:1970:TGB,
author = "H. W. Lorber",
title = "Theory of Granularity and Bleaching for Holographic
Information Recording",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "515--520",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Kelly three-stage model of photographic
information recording is a mathematical model of
black-and-white silver halide film with granularity
neglected. In the work reported here, theory is
extended for use in phase-holographic applications.
Granularity effects are contained in the fourth and
final stage, a two-dimensional, nonhomogeneous,
filtered Poisson process. The output of this stage is a
sample function of the random process that describes
the pattern of modification of the emulsion. Formulas
for the signal-to-noise ratio of a hologram and the
optimum granular behavior are derived as examples of
the use of the granularity model.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); A0768 (Photography, photographic
instruments and techniques); B4350 (Holography)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "EG and G Inc., Las Vegas, NV, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "holography; IBMJA; light, modulation; photographic
applications; photographic emulsions; photography;
photography, holography; us",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Falconer:1970:NDP,
author = "D. G. Falconer",
title = "Noise and Distortion in Photographic Data Storage",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "521--526",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Noise, which tends to be multiplicate, derives from
the random distribution of silver grains in the
photographic image, as well as from thickness
variations in the developed emulsion. Distortion, on
the other hand, results from the nonlinear relation
between transmittance and exposure, the finite width of
the emulsion's point-spread function and the existence
of an adjacency-enhancement function. Although grain
noise remains intrinsic and untreatable, nonlinear
distortion, both global and local may be treated by
lowering the contrast of the exposure pattern or,
preferably, by recording the data in the form of a
phase-modulated carrier wave, as in holography. A
solution to the remaining difficulty, namely,
linear-global distortion, is obtained through the use
of high-resolution, Lippmann-type emulsions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "Stanford Res. Inst., Menlo Park, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "data storage; electric distortion; holography; IBMJA;
light, modulation; noise; photography",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Upatnieks:1970:CDH,
author = "J. Upatnieks and C. D. Leonard",
title = "Characteristics of Dielectric Holograms",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "527--532",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The diffraction efficiency and snr ratio for
two-dimensional and volume diffuse-signal-beam
holograms are calculated and experimentally determined.
Calculations are based on the statistical properties of
the signal beam, and exact integrals rather than series
approximations are used. High signal-to-noise ratio and
high diffraction efficiency are possible, with the peak
calculated diffraction efficiency being 22\% for
two-dimensional and 64\% for volume holograms. The
experimentally achieved efficiencies were 12\% for
two-dimensional and 36\% for volume holograms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "Univ. Michigan, Ann Arbor, MI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "holography; light, modulation",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Schmackpfeffer:1970:HPG,
author = "A. Schmackpfeffer and W. J{\"a}risch and W. W.
Kulcke",
title = "High-Efficiency Phase-Hologram Gratings",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "533--538",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Optimum conditions for the generation of
high-efficiency hologram gratings are presented. The
most efficient phase holograms were obtained for
exposures 10 to 20 times larger than those for
optimally exposed amplitude holograms. Hologram
gratings produced on Agfa Gevaert 8 E 70 recording
plates diffracted 40\% of the incident radiation into
the holographic image. This experimentally obtained
efficiency is 60\% of the theoretical maximum for a
hologram with a geometric parameter Q of 4.6.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "holography; IBMJA; light, modulation; photography",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Ferdinand:1970:SMA,
author = "A. E. Ferdinand",
title = "A statistical mechanical approach to systems
analysis",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "539--547",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90.30 (94.00)",
MRnumber = "42 \#7244",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "212.51602",
abstract = "The maximum entropy principle is used as the criterion
for calculating the equilibrium state probabilities of
a queuing or network system in which service rates are
exponentially distributed. A configuration-independent
partition function is given as the solution to this
network problem; from this function the important
properties of the system may be derived. Simple and
well known examples are used to illustrate the method.
A phenomenon similar to the phase transition of
statistical mechanics is observed in a queuing model.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "computers; IBMJA; queueing theory; queuing theory;
statistical mechanics; statistical methods; systems
analysis; systems engineering",
reviewer = "R. L. Kashyap",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Casey:1970:MNH,
author = "R. G. Casey",
title = "Moment Normalization of Handprinted Characters",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "548--557",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "205.17904",
abstract = "Handprinted characters can be made more uniform in
appearance than the as-written version if an
appropriate linear transformation is performed on each
input pattern. The transformation can be implemented
electronically by programming a flying-spot
raster-scanner to scan at specified angles rather than
only along specified axes. Alternatively,
curve-follower normalization can be achieved by
transforming the coordinate waveforms in a linear
combining network. Second-order moments of the pattern
are convenient properties to use in specifying the
transformation. By mapping the original pattern into
one having a scalar-moment matrix, all linear pattern
variations can be removed. Comparison experiments are
described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "IBM Thomas, J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "character recognition; computers; computers, circuits;
computers, pattern recognition; IBMJA; optical
character recognition; pattern recognition",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Durbeck:1970:PES,
author = "R. C. Durbeck",
title = "Performance equivalence of suboptimally controlled
nonlinear systems",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "558--562",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93.40",
MRnumber = "42 \#5670",
bibdate = "Tue Mar 06 15:32:50 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "205.15605",
abstract = "A procedure is described that shows how a technique
used to develop performance bounds for a large class of
nonlinear dynamic systems with state-dependent control
policies can be extended to determine whether a
nonlinear system can be controlled so that it is at
least `performance equivalent' to an associated
optimally controlled linear system. A procedure for
generating one or more control policies to attain this
equivalence is also discussed. An example illustrates
the fact that more than one control policy may satisfy
the equivalence criterion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1330 (Optimal control); C1340K (Nonlinear control
systems)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "automatic control; IBMJA; linear systems; nonlinear
systems; optimisation; optimization; performance
index",
reviewer = "D. F. Lawden",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Langdon:1970:CED,
author = "G. G. {Langdon, Jr.} and C. K. Tang",
title = "Concurrent Error Detection for Group Look-Ahead Binary
Adders",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "563--573",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68.00 (94.00)",
MRnumber = "42 \#1373",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The relative merits of two schemes for performing
concurrent error detection are evaluated. One of the
schemes is a residue mod 3 check and the other is a
parity prediction check. The Boolean statements that
define the operation of group look-ahead adders,
concurrent error detection and the Boolean difference
serve as background for interpreting the results of the
study. Some weaknesses in prior studies of coverage
calculation are brought to light. Tables showing the
number of circuit elements in the various portions of
adder and error-checking circuits are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130 (Data handling techniques)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "adders; binary adders; codes; computers; computers,
errors; error detection; IBMJA",
reviewer = "J. Kuntzmann",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Kinberg:1970:IMS,
author = "C. Kinberg and B. W. Landeck",
title = "Integrated manufacturing systems: architectural
considerations",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "589--604",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3355 (Control applications in manufacturing
processes)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automation; communication; computers; control system
analysis; control system synthesis; equipment control;
hierarchy concepts; implementation; information
systems; integrated control systems; integrated
manufacturing systems; man machine interface;
manufacturing processes; operational environment;
plant; processors; production support; programming;
real time systems; system architecture; system
requirements",
treatment = "P Practical",
}
@Article{Stuehler:1970:IMP,
author = "J. E. Stuehler",
title = "An integrated manufacturing process control system:
implementation in {IBM} manufacturing",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "605--613",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7420 (Control engineering computing)",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architecture; central computer system; channels;
communication equipment; control engineering
applications of computers; data; digital systems; high
speed data; IBM 360; integrated control; integrated
manufacturing process control; on line; OS/360; process
control; production; satellite processors; system;
systems",
treatment = "P Practical",
}
@Article{Thoburn:1970:TCU,
author = "F. W. Thoburn",
title = "A transmission control unit for high-speed
computer-to-computer communication",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "614--619",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cables; coaxial; computer to computer; computers; data
communication equipment; data modulation; fast-response
computer; high speed communication; IBM;
microprogrammed polling; microprogramming;
multiplexing; noise suppression; process control;
satellite; servicing; systems; terminal connections;
transmission control unit design",
treatment = "P Practical",
}
@Article{Calva:1970:PPC,
author = "J. R. Calva",
title = "{PCOS}: a process control extension to {Operating
System\slash 360}",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "620--632",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems); C7420 (Control engineering
computing)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architecture; control engineering applications of
computers; data routing; fetch module; IBM; operating;
OS/360 extensions; PCOS; process control; real time;
real-time systems; supervisory programs; systems
(computers)",
treatment = "A Application; P Practical",
}
@Article{Fischer:1970:CTF,
author = "R. B. Fischer and C. M. Cox and C. Holdinsky",
title = "Computer-aided testing and fabrication of magnetic
tape heads",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "633--640",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7410B (Power engineering computing)",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications of computers; automatic testing; complex
impedance; computer aided testing; control; data
acquisition; engineering; hysteresis; IBM 1130;
identification; magnetic tape equipment; magnetic tape
heads; manufacture; modules; part; process; process
flow; software control; System 360 satellite; test
terminals; vector impedance meter",
treatment = "A Application; P Practical",
}
@Article{Radio:1970:PAM,
author = "M. R. Radio and S. A. Schmitt and S. H. Lewis and T.
G. Merry and J. L. Evjen",
title = "Precision automatic measuring of {X-Y} coordinates",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "641--651",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7400 (Engineering computing)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "100 microinches tolerance; aperture roughness;
automatic testing; computer control; computers; control
engineering applications of; data analysis; distance
measurement; edge detection; inspection; laser
interferometer; monitoring; PAMM; part; photodetector
shot noise; position; precision automatic measurement;
scanner; X-Y coordinate measurement",
treatment = "P Practical",
}
@Article{Harrison:1970:ISP,
author = "T. J. Harrison and R. L. Homiak and G. U. Merckal",
title = "{IBM System\slash 7} and plant automation",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "652--661",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C7420 (Control
engineering computing)",
corpsource = "IBM, Boca Raton, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; architectural concepts; computer
architecture; computers; control; control engineering
applications of; data acquisition; design features;
facilities; functional characteristics; hardware; IBM;
manufacturing; plant automation; process; processor
module; software; special purpose computers; System 7;
system organisation; test",
treatment = "A Application; P Practical",
}
@Article{Hippert:1970:IDT,
author = "R. O. {Hippert, Jr.}",
title = "{IBM} 2790 digital transmission loop",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "662--667",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
corpsource = "IBM, Triangle Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cable; clock; connection; data acquisition; data
collection; digital; digital communication systems;
digital transmission loop; high speed; IBM 2790; line
driver; repeater; systems; tandem; terminals",
treatment = "P Practical",
}
@Article{Henderson:1970:PTE,
author = "D. J. Henderson and J. A. Barker and R. O. Watts",
title = "The {Percus--Yevick} theory and the equation of state
of the 6:12 fluid",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "668--676",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4710 (General fluid dynamics theory, simulation and
other computational methods)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "6:12 fluid; calculation; compressibility;
computational method; distribution function; equation
of state; equations of state; fluids; identities;
indirect method of calculation; machine; pair; Percus
Yevick theory; thermodynamic",
treatment = "T Theoretical or Mathematical",
}
@Article{Marcus:1970:ICM,
author = "M. P. Marcus and W. H. Niehoff",
title = "Iterated consensus method for multiple-output
functions",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "677--679",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; Boolean functions; iterated consensus
method; iterative methods; multiple output functions;
prime implicants",
treatment = "T Theoretical or Mathematical",
}
@Article{Filipowsky:1970:CMT,
author = "R. F. Filipowsky",
title = "On the correlation matrices of trigonometric product
functions",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "680--685",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1120 (Mathematical analysis)",
corpsource = "IBM, Huntsville, AL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "communications technology; correlation matrices;
correlation methods; cross correlation coefficients;
factors; harmonic; matrix algebra; network analysis;
Parseval's theorem; signal processing; trigonometric
product functions; waveform analysis; waveforms",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Blakeslee:1970:MSC,
author = "A. E. Blakeslee and C. F. Aliotta",
title = "Man-made superlattice crystals",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "686--688",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8110B (Crystal growth from vapour)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AsH/sub 3/-PH/sub 3/-Ga-HCl; characterization;
crystal; crystal atomic structure of inorganic
compounds; crystal growth process; dimensional
superlattice approximation; formation by; GaAs/sub
1-x/P/sub x/; gallium arsenide; growth; lattice theory
and statistics; methods of; one-; periodically pulsing
PH/sub 3/; synthetic superlattice crystals; vapour
growth",
treatment = "X Experimental",
}
@Article{Aas:1970:CTT,
author = "E. J. Aas",
title = "Comment on `{A} topological theory of domain velocity
in semiconductors'",
journal = j-IBM-JRD,
volume = "14",
number = "6",
pages = "689--690",
month = nov,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:25:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Gunn:1969:TTD}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators); B2560F (Bulk effect
devices)",
corpsource = "Inst. Technol., Trondheim, Norway",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "diffusion controlled domain; domain velocity; domains;
semiconductors; topological theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Anonymous:1970:CHC,
author = "Anonymous",
title = "Conference on holography and the computer",
journal = j-IBM-JRD,
volume = "14",
number = "5",
pages = "??--??",
month = sep,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240 (Holography); B4350 (Holography); C5320Z (Other
digital storage)",
conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
conftitle = "Conference on holography and the computer",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "holography",
sponsororg = "Optical Soc. America, Gulf Coast section; IBM Corp",
}
@Article{Anonymous:1970:SMS,
author = "Anonymous",
title = "Symposium on magnetic semiconductors",
journal = j-IBM-JRD,
volume = "14",
number = "3",
pages = "??--??",
month = may,
year = "1970",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7125 (Nonlocalized single-particle electronic
states); A7500 (Magnetic properties and materials);
A7800 (Optical properties and condensed matter
spectroscopy and other interactions of matter with
particles and radiation); A7220 (Electrical
conductivity phenomena in semiconductors and
insulators); A7280 (Conductivity of specific
semiconductors and insulators)",
conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
conftitle = "Symposium on magnetic semiconductors",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "band structure; electrical conductivity of solids;
electron; magnetic materials; magnetic properties of;
magnetisation state; mobility; semiconductor materials;
substances",
sponsororg = "American Phys. Soc.; IBM Corp",
}
@Article{Kwok:1971:DSG,
author = "H. C. W. Kwok and W. E. Langlois and R. A. Ellefsen",
title = "Digital simulation of the global transport of carbon
monoxide",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "3--9",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9260 (Lower atmosphere); C7320 (Physics and chemistry
computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "atmosphere; atmospheric composition; carbon compounds;
chaining effects; CO; cumulus convection; digital
simulation; gasoline consumption; global transport;
northern hemisphere sources; physics; prevailing
westerly winds; subscale; vertical transport",
treatment = "T Theoretical or Mathematical",
}
@Article{Hunziker:1971:NTG,
author = "H. E. Hunziker",
title = "A new technique for gas-phase kinetic spectroscopy of
molecules in the triplet state",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "10--26",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765 (Optical spectroscopy and spectrometers); A3320
(Molecular spectra grouped by wavelength ranges);
A3350H (Molecular radiationless transitions); A3370F
(Molecular lifetimes, absolute and relative line and
band intensities)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "absorption; benzene; gas phase kinetic spectroscopy;
Hg photosensitization; lifetime; measurements;
modulated Hg resonance light source; molecular
excitation; molecules; molecules and substances;
naphthalene; organic compounds; polyatomic; population;
spectra of organic; spectroscopic light sources;
spectroscopy; toluene; triplet states",
treatment = "N New Development; X Experimental",
}
@Article{Castro:1971:PAH,
author = "G. Castro",
title = "Photoconduction in aromatic hydrocarbons",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "27--33",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7240 (Photoconduction and photovoltaic effects;
photodielectric effects)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "aromatic hydrocarbons; benzene; biphenyl; crystal
growth; drift mobilities; exciton exciton collision
ionization; generation; growth; naphthalene; organic
compounds; photoconduction; photoconductivity;
purification; pyrene; single crystals; single photon",
treatment = "X Experimental",
}
@Article{Young:1971:PTS,
author = "W. R. Young and I. Haller and A. Aviram",
title = "Preparation and thermodynamics of some homologous
nitrones, a new group of liquid crystals",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "41--51",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6470M (Transitions in liquid crystals)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "aldonitrones; alkoxy chain length; liquid crystals;
mesophase isotropic; mesophases; N-(p-alkoxyphenyl)
alpha anisylnitrones; nematic; nematic isotropic;
organic compounds; phase transformations; preparation;
smectic mesophases; thirteen homologs; transition;
transition entropy",
treatment = "X Experimental",
}
@Article{Vogel:1971:PCE,
author = "M. J. Vogel and E. M. Barrall and C. P. Mignosa",
title = "Polymorphism in cholesteryl esters: cholesteryl
palmitate",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "52--8",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6130 (Liquid crystals); A6470M (Transitions in liquid
crystals)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cholesteric isotropic liquid transition; cholesterol
ester; cholesteryl esters; cholesteryl palmitate;
impurity effect; isomeric; liquid crystals; organic
compounds; phase transformations; polymorphism; related
compound interaction; smectic cholesteric; smectic
monotropic mesophase; solid mesophase transition
temperature; thermal transitions; transition",
treatment = "X Experimental",
}
@Article{Yannoni:1971:MNM,
author = "C. S. Yannoni",
title = "On measuring nuclear magnetic shielding anisotropies
in liquid crystal solvents",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "59--63",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7660 (Nuclear magnetic resonance and relaxation)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "/sup 1/h; /sup 19/f containing molecules;
6<or=A<or=19; containing molecules; liquid crystal;
liquid crystals; nematic phase; nuclear magnetic
resonance; nuclear magnetic shielding anisotropies;
nuclei with; nuclei with A<or=5; single phase
measurement; solvents",
treatment = "X Experimental",
}
@Article{Kobayashi:1971:APD,
author = "H. Kobayashi",
title = "Application of probabilistic decoding to digital
magnetic recording systems",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "64--74",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C5320E
(Storage on stationary magnetic media); C6130 (Data
handling techniques)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; correlative level; decoding; decoding
errors; digital magnetic recording systems; digital
storage; encoder; information theory; magnetic storage;
maximum likelihood decoding method; recording;
systems",
treatment = "T Theoretical or Mathematical",
}
@Article{Schaffert:1971:NHO,
author = "R. M. Schaffert",
title = "A new high-sensitivity organic photoconductor for
electrophotography",
journal = j-IBM-JRD,
volume = "15",
number = "1",
pages = "75--89",
month = jan,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0768 (Photography, photographic instruments and
techniques); A7240 (Photoconduction and photovoltaic
effects; photodielectric effects)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.15; 1 to 1; carrier generation; charge acceptance;
charging; corona; dark decay; electrophotography;
films; materials; molar 2,4,7-trinitro-9-fluorenone
poly-n-vinylcarbazole; organic compounds; organic
polymeric photoconductor; panchromatic in visible
spectrum; photoconductivity; photographic;
photosensitivity; polymers; quantum efficiency",
treatment = "N New Development; X Experimental",
}
@Article{Bayer:1971:WEC,
author = "R. G. Bayer and J. L. Sirico",
title = "Wear of electrical contacts due to small-amplitude
motion",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "103--107",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2180 (Electrical contacts)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electrical contacts; IBM; model; sliding contact; wear
due to small amplitude motion",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Engle:1971:APS,
author = "P. A. Engle and H. D. Conway",
title = "Adhesion and partial slip between normally loaded
round surfaces",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "116--122",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6220P (Tribology); A8140P (Friction, lubrication, and
wear)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; contact; Coulomb friction; energy
dissipation; friction; normally loaded round surfaces;
partial slip; rigid roller; rigid sphere; slip; stress
analysis",
treatment = "T Theoretical or Mathematical",
}
@Article{Howard:1971:ADD,
author = "J. K. Howard and P. J. Smith",
title = "Analysis of defect distribution in transistor
structures with reflection and transmission {X}-ray
topography",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "123--131",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170 (Defects in crystals); B2550 (Semiconductor
device technology); B2560S (Other field effect
devices); B2570 (Semiconductor integrated circuits)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; defect distribution; defects; depth of
defect visibility; dislocations; effect of dislocation
density; estimate; gamma-ray applications; integrated
circuit; reflection X-ray topography; semiconductor;
semiconductor defects; testing; transistor structures;
transistors; transmission X-ray topography; X-ray;
X-ray examination of materials",
treatment = "P Practical",
}
@Article{Makris:1971:EET,
author = "J. Makris and A. Ferris-Prabhu and M. L. Joshi",
title = "Effect of extremely thin nitrogenous surface films on
phosphorus-impurity profiles in silicon",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "132--139",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630J (Diffusion, migration, and displacement of
impurities in solids); A7220 (Electrical conductivity
phenomena in semiconductors and insulators); A7280C
(Conductivity of elemental semiconductors); B0520 (Thin
film growth); B2550 (Semiconductor device technology);
B2560B (Semiconductor device modelling and equivalent
circuits); B2560 (Semiconductor devices)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal impurities; dependence; diffusion; diffusion
barriers; diffusion in solids; elemental
semiconductors; extremely thin nitrogeneous surface
film effect; films; impurity concentration in carrier
gas dependence; mathematical model; nitrogen;
phosphorus; phosphorus impurity profile; semiconductor
defects; semiconductor device models; semiconductor
materials; silicon; temperature",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Anderson:1971:MED,
author = "H. R. {Anderson, Jr.} and E. A. Bartkus and J. A.
Reynolds",
title = "Molecular engineering in the development of materials
for thermoplastic recording",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "140--150",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3620 (Macromolecules and polymer molecules)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "charging; copolymers; corona; electron geams effects;
erase temperatures; in air recording; in vacuum
recording; materials; molecular engineering; molecular
weight; photoconductivity; plastic deformation;
polymers; recording; Schlieren optical readout;
terpolymers; thermoplastic recording; viscosity",
treatment = "X Experimental",
}
@Article{Pesch:1971:CBD,
author = "J. A. Pesch",
title = "On the correlation between domain size and coercive
force in grain-oriented 3.25\% {Si-Fe}",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "151--152",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7560E (Magnetization curves, hysteresis, Barkhausen
and related effects); B3110C (Ferromagnetic
materials)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "alloys; coercive; components; data processing
machines; domains; ferromagnetic properties of
substances; force; grain oriented Si-Fe; iron; largest
spike shaped magnetic domains measurement; magnetic
materials; magnetisation; non toroidal magnetic;
silicon compounds",
treatment = "A Application; P Practical",
}
@Article{Hoffman:1971:SMR,
author = "R. L. Hoffman and J. W. McCullough",
title = "Segmentation methods for recognition of
machine-printed characters",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "153--165",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "machine printed characters; optical character
recognition; quasitopological segmentation; topological
segmentation",
treatment = "P Practical",
}
@Article{Duke:1971:SVT,
author = "K. A. Duke and H. D. Schnurmann and T. I. Wilson",
title = "System validation by three-level modelling synthesis",
journal = j-IBM-JRD,
volume = "15",
number = "2",
pages = "166--174",
month = mar,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1220 (Simulation, modelling and identification);
C5200 (Logic design and digital techniques)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architecture; computer; computer architecture;
computer design; design; hardware logic; logic design;
microprogramming; mismatches identification; modelling;
system programming; system validation; three level
modelling synthesis",
treatment = "P Practical",
}
@Article{Fromm:1971:NMC,
author = "J. E. Fromm",
title = "Numerical method for computing nonlinear, time
dependent, buoyant circulation of air in rooms",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "186--196",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4170 (Differential equations)",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air circulation; algorithms; buoyant circulation;
computing; dependent; difference equations;
environmental; flow direction; Grashof numbers; heat
transfer coefficients; leading phase errors; nonlinear
differential equations; nonlinear partial differential
equations; nonlinear stability; numerical method;
numerical methods; rooms; temperatures; time; time
splitting",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Smart:1971:RMS,
author = "J. S. Smart and V. L. Moruzzi",
title = "Random-walk model of stream network development",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "197--203",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7390 (Other natural sciences computing)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "dendritic networks; drainage density; fluvial erosion;
headward growth model; modelling; natural sciences;
outlet density; random processes; random walk model;
slope; stream network development; uniform lithology",
treatment = "T Theoretical or Mathematical",
}
@Article{Guido:1971:APP,
author = "A. A. Guido and L. Fulkerson and P. E. Stuckert",
title = "Automatic pulse parameter determination with the
{Computer Augmented Oscilloscope System}",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "204--212",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7320 (Physics and chemistry computing)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "alphanumeric display; analysis; automatic pulse
parameter determination; calibration; Computer
Augmented; data; digital acquisition; display systems;
graphics; instrumentation; laboratory experiments;
Oscilloscope System; pulse waveform interpretation;
system control; waveform analysis; waveform data",
treatment = "P Practical; X Experimental",
}
@Article{Seki:1971:QAE,
author = "H. Seki and I. P. Batra and W. D. Gill and K. K.
Kanazawa and B. H. Schechtman",
title = "A quasi-steady-state analysis for the
electrophotographic discharge process",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "213--221",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0768 (Photography, photographic instruments and
techniques); B4200 (Optoelectronic materials and
devices); B8660 (Power applications in printing
industries)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "amorphous Se; analysis; electrophotographic discharge;
free carrier lifetimes; homogeneous photoconductor;
nonlinear differential equations; numerical; one
dimensional; photoconducting materials;
photoconductivity; photography; photoinjection;
process; quasi steady state analysis; selenium;
trapping times",
treatment = "T Theoretical or Mathematical",
}
@Article{Lester:1971:IPB,
author = "W. A. {Lester, Jr.}",
title = "Interaction potential between {Li$^+$} and {HD}:
region for rotational excitation cross sections",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "222--229",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3310E (Rotational analysis (molecular spectra));
A3370F (Molecular lifetimes, absolute and relative line
and band intensities); A3420 (Interatomic and
intermolecular potentials and forces); A3440 (Elastic
scattering of atoms and molecules); A3450 (Inelastic
scattering of atoms and molecules); A3520P (Molecular
rotation, vibration, and vibration-rotation
constants)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "atomic collision processes; cross sections; energy;
energy surface; excitation; HD; hydrogen neutral
molecules; interaction potential; intermolecular
potentials; internal vibrational; Li/sup +/; lithium;
molecular; molecular collision processes; molecular
rotation; perturbation theory; potential;
probabilities; rotational excitation; rotational
transition; self consistent field calculation",
treatment = "T Theoretical or Mathematical",
}
@Article{Dushkes:1971:DSU,
author = "S. Z. Dushkes",
title = "A design study of ultrasonic bonding tips",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "230--235",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170G (General fabrication techniques); B7820 (Sonic
and ultrasonic applications)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Au plated; boards; bonding failure; CuBeO wire; design
study; electronic circuit; electronic equipment
manufacture; joining processes; lug down; standing
wave; ultrasonic applications; ultrasonic bonding tips;
wire density",
treatment = "P Practical; X Experimental",
}
@Article{Lederle:1971:HCA,
author = "G. M. Lederle",
title = "Heat-transfer calculations at the tape-head interface
of a computer tape drive",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "236--241",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C5320 (Digital
storage)",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "21 degrees C; computer metatheory; computer tape
drive; drive; frictional heat transfer calculations;
hot spotting; IBM 2400 series tape; interface; magnetic
tape equipment; magnetic tape head; physics",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Bush:1971:CFE,
author = "D. R. Bush",
title = "The common-core filter as an electromagnetic
interference-suppression device",
journal = j-IBM-JRD,
volume = "15",
number = "3",
pages = "242--244",
month = may,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1270 (Filters and other networks)",
corpsource = "IBM, Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "common core filter; device; electromagnetic
interference suppression; filters; interference
suppression; noise suppression devices; powerline
filters",
treatment = "P Practical; X Experimental",
}
@Article{Marinace:1971:EFO,
author = "J. C. Marinace",
title = "Experimental fabrication of one-dimensional {GaAs}
laser arrays",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "258--264",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4320J (Semiconductor lasers)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arrays; diffusion; EuO film memory system; films; GaAs
laser; injection laser fabrication; magnetic thin film
devices; semiconductor lasers; semiconductor materials;
thermal writing on magnetic; Zn diffusion",
treatment = "X Experimental",
}
@Article{Sprokel:1971:FPM,
author = "G. J. Sprokel",
title = "Fabrication and properties of monolithic laser diode
arrays",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "265--271",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4320J (Semiconductor lasers)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Ag; Al/sub 2/O/sub 3/; arrays; Cr; diffusion; EuO
film; liquid nitrogen cooling; magnetooptical;
manufacturing processes; masking; memories; monolithic
laser diode; Ni; photolithography; planar diffused GaAs
injection lasers; sapphire wafer; semiconductor lasers;
semiconductor materials; Zn",
treatment = "P Practical",
}
@Article{Wieder:1971:CGL,
author = "H. Wieder and H. Werlich",
title = "Characteristics of {GaAs} laser arrays designed for
beam addressable memories",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "272--277",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320Z (Other digital storage)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "10 MHZ; beam addressable memories; EuO film; GaAs
laser arrays; magnetic film stores; optical storage
devices; read/write operations; semiconductor; storage
devices",
treatment = "X Experimental",
}
@Article{Huth:1971:DFR,
author = "B. G. Huth and M. R. Agan",
title = "Dynamics of a flashlamp-pumped rhodamine {6G} laser",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "278--292",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255M (Lasing action in liquids and organic dyes);
A4260 (Laser systems and laser beam applications);
B4320E (Liquid lasers and organic dye lasers)",
corpsource = "IBM, Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "anthracene; computer applications; dye laser;
flashlamp pumped rhodamine 6G laser; lifetimes; liquid
lasers; model; modelling; organic compounds; stimulated
emission; triplet state",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Grant:1971:ISR,
author = "P. M. Grant",
title = "Interleaving slow and rapid-data-rate experiments with
a time-sharing laboratory automation system",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "293--293",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3380D (Control of physical instruments); C7320
(Physics and chemistry computing); C7420 (Control
engineering computing)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acquisition; computer control; control engineering
applications of computers; data; data acquisition;
instrumentation; laboratory automation system; time
sharing laboratory automation system",
treatment = "A Application",
}
@Article{Schechtman:1971:ADA,
author = "B. H. Schechtman and P. M. Grant",
title = "Automation of data acquisition in transient
photoconductive decay experiments",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "296--306",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3380D (Control of physical instruments); C7320
(Physics and chemistry computing); C7420 (Control
engineering computing)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acquisition; computer aided analysis; computers;
control engineering applications of; data; data
acquisition; devices; electrostatic copiers; physics;
radiation detectors; television imaging; transient
photoconductive decay experiments",
}
@Article{Anonymous:1971:ARG,
author = "Anonymous",
title = "Automation of a residual gas analyzer in a time-shared
computer",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "307--312",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3380D (Control of physical instruments); C7320
(Physics and chemistry computing); C7420 (Control
engineering computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automation in data acquisition; computer aided
analysis; computers; control engineering applications
of; instrumentation; mass spectrometry; partial
pressures of gaseous species; quadrupole mass; residual
gas analyzer; shared computer; spectrometer; time",
}
@Article{Kahan:1971:ECC,
author = "G. J. Kahan",
title = "Equivalent circuit for conductivity-temperature
characteristics of the {PdO\slash Ag-Pd} glaze
resistor",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "313--317",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2120 (Resistors)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "conductivity/temperature relationship; equivalent
circuit; equivalent circuits; materials properties;
PdO/Ag-Pd glaze resistor; resistors",
treatment = "T Theoretical or Mathematical",
}
@Article{Greenberg:1971:IMD,
author = "S. G. Greenberg and Y. Bard",
title = "An improved method for designing optimal linear
compensators",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "318--322",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65L99",
MRnumber = "46 \#2881",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "256.93058",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1340G (Time-varying control systems)",
corpsource = "MIT, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "control; deterministic regulator problem; linear
systems; observation noise; optimal control; optimal
linear compensators; quadratic cost criteria; Riccati
equations; stochastic; stochastic systems; white
Gaussian plant",
reviewer = "V. Ionescu",
treatment = "T Theoretical or Mathematical",
}
@Article{Bosarge:1971:SNR,
author = "W. E. {Bosarge, Jr.} and C. L. Smith",
title = "Some numerical results for iterative continuation in
nonlinear boundary-value problems",
journal = j-IBM-JRD,
volume = "15",
number = "4",
pages = "323--327",
month = jul,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65N10",
MRnumber = "47 \#1303",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "258.65086",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4170 (Differential equations)",
corpsource = "IBM, Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "boundary-value problems; continuous analogue iterative
methods; differential equations; iterative methods;
nonlinear; nonlinear boundary; relaxed Newton method;
value problems",
reviewer = "K. Frankowski",
treatment = "T Theoretical or Mathematical",
}
@Article{Oktay:1971:MSB,
author = "S. Oktay",
title = "Multi-fluid subdued boiling; theoretical analysis of
multi-fluid interface bubbles",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "342--354",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6470F (Liquid-vapour transitions)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "boiling; bubbles; change; fluids; heat transfer;
immiscible liquids; interface bubble sizes; liquid/air
interface; liquid/liquid interface; liquids; multifluid
subdued boiling; of state; thermal properties of
liquids",
treatment = "T Theoretical or Mathematical",
}
@Article{Hartwell:1971:PIF,
author = "J. W. Hartwell",
title = "A procedure for implementing the fast {Fourier}
transform on small computers",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "355--363",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65T05",
MRnumber = "45 \#6219",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods)",
corpsource = "Florida Atlantic Univ., Boca Racton, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; computer; Cooley Tukey; data acquisition;
discrete Fourier transform; Fast Fourier Transform;
fast Fourier transforms; IBM System/7; real time
processing",
reviewer = "P. Brock",
treatment = "A Application",
}
@Article{Choquet:1971:GSD,
author = "M. F. Choquet and H. J. Nussbaumer",
title = "Generation of synchronous data transmission signals by
digital echo modulation",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "364--377",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120 (Modulation methods)",
corpsource = "IBM, Alpes Maritimes, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data transmission techniques; demodulators; digital
echo modulation; digitally implemented modem
transmitters; frequency shift keying; keying; linear;
modulation; modulators; phase shift; vestigial
sideband",
treatment = "T Theoretical or Mathematical",
}
@Article{Shine:1971:AEE,
author = "M. C. Shine and F. M. D'Heurle",
title = "Activation energy for electromigration in aluminium
films alloyed with copper",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "378--383",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630 (Diffusion in solids); A6855 (Thin film growth,
structure, and epitaxy); A6860 (Physical properties of
thin films, nonelectronic); A7215 (Electronic
conduction in metals and alloys); B2110 (Conductors)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.6 eV; activation energy; Al alloys; aluminium
alloys; aluminium films; copper alloys; Cu alloys;
diffusion in solids; electrical conductivity;
electrical conductivity of solids; electromigration;
films; grain boundaries; grain boundary diffusion;
resistance measurement; thick films; thin; thin films",
treatment = "X Experimental",
}
@Article{Fox:1971:DLC,
author = "P. E. Fox and W. J. Nestork",
title = "Design of logic circuit technology for {IBM
System\slash 370 Models 145} and 155",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "384--390",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1260 (Pulse circuits); B1265 (Digital electronics);
C5210 (Logic design methods)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ceramic substrate; circuit; current switch emitter
follower; DTL; IBM System/370 models 145 and 155;
integrated circuits; logic; logic circuits; logic
design; microelectronic circuit; monolithic integrated
circuits; monolithic system technology; TTL",
treatment = "G General Review",
}
@Article{Irwin:1971:IMT,
author = "J. W. Irwin and J. V. Cassie and H. C. Oppeboen",
title = "The {IBM 3803\slash 3420} magnetic tape subsystem",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "391--400",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320 (Digital storage)",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "check; computer's central processing; control systems;
correction; IBM 3803/3420 magnetic tape subsystem;
magnetic tape equipment; microprogram control;
monolithic technology; phase error detection and; read
only storage control; readback parity; reel control;
unit",
treatment = "G General Review",
}
@Article{Keyes:1971:TPC,
author = "R. W. Keyes",
title = "Thermal problems of the {CW} injection laser",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "401--404",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255P (Lasing action in semiconductors); A4260 (Laser
systems and laser beam applications); B4320J
(Semiconductor lasers)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electrical resistance; properties of substances;
resistance; semiconductor continuous wave injection
laser; semiconductor junction temperature;
semiconductor junctions; semiconductor lasers; thermal;
threshold current",
treatment = "T Theoretical or Mathematical",
}
@Article{Zappe:1971:UOJ,
author = "H. H. Zappe and K. R. Grebe",
title = "Ultra-high-speed operation of {Josephson} tunnelling
devices",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "405--407",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3240C (Superconducting junction devices)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "gate switching time; Josephson junctions; Josephson
tunnelling devices; logic circuits; memory cell; Pb
alloy; SiO; switching systems; tunnelling",
}
@Article{Philipp-Rutz:1971:SWO,
author = "E. M. Philipp-Rutz",
title = "Synchronization in a wideband optical data
transmission system",
journal = j-IBM-JRD,
volume = "15",
number = "5",
pages = "408--412",
month = sep,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6260 (Optical links and equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "coding; coincidence detection; data transmission
systems; demultiplexer; laser beam; optical links;
optical synchronization technique; PCM channels;
receiver; synchronisation; technique; transmission
system; wideband optical data",
treatment = "T Theoretical or Mathematical",
}
@Article{Sitton:1971:DTI,
author = "G. A. Sitton",
title = "Direct technique for improving a matrix inverse",
journal = j-IBM-JRD,
volume = "15",
number = "??",
pages = "413--417",
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65.35",
MRnumber = "44 \#6141",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "266.65027",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. Niethammer",
}
@Article{Vora:1971:SSI,
author = "M. B. Vora",
title = "A self-isolation scheme for integrated circuits",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "430--435",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cell; double diffusion process; integrated circuits;
logic cell; memory; self isolation scheme;
semiconductor device manufacture; transistor
fabrication; transistors",
treatment = "P Practical",
}
@Article{Ghosh:1971:DDU,
author = "H. N. Ghosh and K. G. Ashar and A. S. Oberai and D.
Dewitt",
title = "Design and development of an ultralow-capacitance,
high-performance pedestal transistor",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "436--442",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560J (Bipolar transistors)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "collector base junction; collector series resistance;
high current densities; high performance
characteristics; highly doped collector region; large
impurity gradient; low; pedestal; planar IC process;
small geometries; transistor; transistor structure;
transistors; ultra low capacitance",
treatment = "P Practical; X Experimental",
}
@Article{Anantha:1971:PMS,
author = "N. G. Anantha and K. G. Ashar",
title = "Planar mesa {Schottky} barrier diode",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "442--445",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560H (Junction and barrier diodes)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "characteristics; high breakdown voltages; mesa
Schottky diodes; planar silicon technology; processing
techniques; Schottky-barrier diodes; semiconductor
device manufacture",
treatment = "P Practical",
}
@Article{Magdo:1971:EBF,
author = "S. Magdo and C. H. Ting and M. Hatzakis",
title = "Electron beam fabrication of micron transistors",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "446--451",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560J (Bipolar transistors); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar transistors; components in integrated
circuits; dc and ac characteristics; electron beam;
experimental process; exposure; fabrication process;
guide for refinement; high; high speed performances;
integrated circuit production; micron transistor
design; packing density; semiconductor device
manufacture; small transistor fabrication",
treatment = "P Practical",
}
@Article{Ziegler:1971:EEH,
author = "J. F. Ziegler and B. L. Crowder and W. J.
Kleinfelder",
title = "Experimental evaluation of high energy ion
implantation gradients for possible fabrication of a
transistor pedestal collector",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "452--456",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520 (Thin film growth); B2550B (Semiconductor
doping); B2550 (Semiconductor device technology);
B2560J (Bipolar transistors)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "boron; characteristics; collector pedestal
fabrication; concentration gradients; high energy ion
implantation; high speed switching; ion implantation;
phosphorus; semiconductor doping; transistor;
transistors",
treatment = "X Experimental",
}
@Article{Ghosh:1971:AES,
author = "H. N. Ghosh and A. S. Oberai and M. B. Vora and J. J.
Chang",
title = "An arsenic emitter structure for high-performance
silicon transistors",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "457--463",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560J (Bipolar transistors)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arsenic emitter structure; arsenic process; bipolar
silicon; bipolar transistors; crystal defects; devices;
diffusion depth; high density; high performance; lower;
sheet conductivity; silicon; small geometry; steeper
gradient; surface concentration; transistors",
treatment = "X Experimental",
}
@Article{Sandhu:1971:ASV,
author = "J. S. Sandhu and J. L. Reuter",
title = "Arsenic source vapour pressure kinetics and capsule
diffusion",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "464--471",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630 (Diffusion in solids); A7220 (Electrical
conductivity phenomena in semiconductors and
insulators); A7280C (Conductivity of elemental
semiconductors); B2550 (Semiconductor device
technology)",
corpsource = "Cogar Corp., Wappingers Falls, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "capsule diffusion; diffusion; diffusion in solids;
elemental semiconductors; homogenized preparation;
kinetics of arsenic vapor pressure; measurement; role
of vapor pressure; semiconductor materials; SiAs source
material; silicon",
treatment = "P Practical",
}
@Article{Chiu:1971:DMA,
author = "T. L. Chiu and H. N. Ghosh",
title = "A diffusion model for arsenic in silicon",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "472--476",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); C7320
(Physics and chemistry computing)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arsenic diffusion; computer program; diffusion;
physics; profiles; semiconductor materials; silicon",
treatment = "T Theoretical or Mathematical",
}
@Article{Ruehli:1971:NCM,
author = "A. E. Ruehli and D. M. Ellis",
title = "Numerical calculation of magnetic fields in the
vicinity of a magnetic body",
journal = j-IBM-JRD,
volume = "15",
number = "6",
pages = "478--482",
month = nov,
year = "1971",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0755 (Magnetic instruments and techniques); C4190
(Other numerical methods)",
corpsource = "IBM, Burlington, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "calculation; constant permeability; different
thicknesses; integral equation approach; integral
equations; magnetic fields; methods; numerical; of
magnetic body; physics; rectangular body; static
magnetic fields; vicinity",
treatment = "T Theoretical or Mathematical",
}
@Article{Collins:1972:SPT,
author = "R. H. Collins and E. G. Grochowski and W. D. North",
title = "Silicon process technology for monolithic memory",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "2--10",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560Z (Other semiconductor devices); B2570
(Semiconductor integrated circuits); C5320G
(Semiconductor storage)",
corpsource = "IBM, East Fishkill, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crystal orientation; good junction; high speed
circuits; improved gain at low current; integrated
circuits; larger starting; monolithic integrated
circuits; monolithic memory; quality; semiconductor
device manufacture; semiconductor materials;
semiconductor storage devices; Si process technology;
substrates",
treatment = "N New Development; P Practical",
}
@Article{Ahearn:1972:DII,
author = "G. R. Ahearn and Y. Dishon and R. N. Snively",
title = "Designs innovations of the {IBM} 3830 and 2835 storage
control units",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "11--18",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer architecture; Disk Storage; IBM 2305 Fixed
Head Storage; IBM 3330; magnetic storage systems;
storage; storage control units; units",
treatment = "N New Development; P Practical",
}
@Article{Brown:1972:RPA,
author = "B. R. Brown",
title = "Readout performance analysis of a cryogenic
magneto-optical data storage system",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "19--26",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120N (Magnetic thin film devices); B3240
(Superconducting devices); B4160 (Magneto-optical
devices); C5320Z (Other digital storage)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "beam addressable file model; cryoelectric stores;
cryogenic; cryogenic magneto optical data storage
system; cryogenics; Curie point; doped; EuQ film;
Faraday readout; film stores; GaAs injection lasers;
laser beam; magnetic; magnetic film stores; magnetic
storage devices; magnetic thin film devices; magneto
optical film; magneto-optical effects; noise; noise
generation; optical stores; readout performance
analysis; readout signal; writing",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Jones:1972:TDD,
author = "R. E. {Jones, Jr.}",
title = "Theories of the distribution of deposit from sputtered
disk and rectangular electrodes",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "27--34",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2320 (Electron emission, materials and cathodes)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "additional emission; cosine emission law; disk and
rectangular electrodes; distorted inward; distribution
of deposit; electrodes; emission; film deposit;
sputtering; under cosine emission; uniform emission",
treatment = "T Theoretical or Mathematical",
}
@Article{Jutzi:1972:CTS,
author = "W. Jutzi and C. H. Schuenemann",
title = "Cross-coupled thyristor storage cell",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "35--44",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2560J (Bipolar
transistors); B2560Z (Other semiconductor devices);
B2570 (Semiconductor integrated circuits); C5320G
(Semiconductor storage)",
corpsource = "IBM, Zurich, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cross coupled thyristor storage cell; integrated
circuits; lateral pnp transistor; semiconductor storage
devices; Si planar technology; symmetrical; thyristor
applications; vertical npn transistor",
treatment = "P Practical",
}
@Article{Hassitt:1972:EEA,
author = "A. Hassitt and L. E. Lyon",
title = "Efficient evaluation of array subscripts of arrays",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "45--57",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; array subscripts of arrays; compilers; efficient
evaluation; language; languages; multiple subscripts;
procedure oriented; procedure oriented languages;
program compilers; selection operations",
treatment = "P Practical",
}
@Article{Hatfield:1972:EPS,
author = "D. J. Hatfield",
title = "Experiments on page size, program access patterns, and
virtual memory performance",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "58--66",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6130 (Data handling
techniques)",
corpsource = "IBM, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "localized use of memory space; page management; page
size; paging; program access patterns; simulators;
storage allocation; Storage allocation; time for access
and software; virtual memory performance",
treatment = "X Experimental",
}
@Article{Maissel:1972:SHS,
author = "L. I. Maissel and C. L. Standley and L. V. Gregor",
title = "Sputter-etching of heterogeneous surfaces",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "67--70",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2180 (Electrical contacts); B2220 (Integrated
circuits); B2570 (Semiconductor integrated circuits)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "catcher; control of; etching; heterogeneous surfaces;
redeposition; reemitted particles; sputter etching;
sputtering; sputtering chamber; trapping",
treatment = "P Practical; X Experimental",
}
@Article{Silvestri:1972:GER,
author = "V. J. Silvestri and T. B. Light and H. N. Yu and A.
Reisman",
title = "{Ge} epitaxial refill deposition techniques for
fabricating pedestal transistor structures",
journal = j-IBM-JRD,
volume = "16",
number = "1",
pages = "71--5",
month = jan,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B2550G (Lithography);
B2560J (Bipolar transistors); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar transistors; capacitance; deposited SiQ/sub 2/
mask; electrical; epitaxial growth; etch epitaxial
technique; fabricating pedestal transistor structures;
Ge epitaxial refill deposition techniques; integrated
circuits; junction characteristics; low parasitic; of
semiconductors; properties; ridge minimizing; selective
deposition; semiconductor device manufacture",
treatment = "P Practical",
}
@Article{Abraham:1972:MTR,
author = "F. F. Abraham and R. N. Kortzeborn and H. G. Kolsky
and S. K. Jordan",
title = "Model for time-dependent raindrop size distributions;
application to the washout of airborne contaminants",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "91--100",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9260 (Lower atmosphere); B7710B (Atmospheric,
ionospheric and magnetospheric techniques and
equipment)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "airborne particles; atmospheric profile; atmospherics;
coalescence; drops; modelling; rain; raindrop size
distributions; terrestrial atmosphere; washout
process",
treatment = "P Practical",
}
@Article{Botkin:1972:RLA,
author = "D. B. Botkin and J. F. Janak and J. R. Wallis",
title = "Rationale, limitations, and assumptions of a
northeastern forest growth simulator",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "101--116",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7890 (Other special applications of computing)",
corpsource = "Yale Univ. New Haven, CT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "agriculture; computer program; forest growth
simulator; program parameters; simulation; site
quality; soil moisture storage",
treatment = "P Practical",
}
@Article{Freeze:1972:SHA,
author = "R. A. Freeze",
title = "Subsurface hydrology at waste disposal sites",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "117--129",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9190 (Other topics in solid Earth physics); B7710
(Geophysical techniques and equipment)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Earth; flow of liquids; formations; geologic; ground
based waste disposal; groundwater flow systems;
hydrochemical reactions; liquid wastes; mathematical
model; modelling; pollution; soil; soil moisture;
subsurface pollution; surface water pollution; waste
lagoons",
treatment = "P Practical",
}
@Article{Gambolati:1972:ESV,
author = "G. Gambolati",
title = "Estimate of subsidence in {Venice} using a
one-dimensional model of the subsoil",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "130--137",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9190 (Other topics in solid Earth physics)",
corpsource = "IBM, San Polo, Venice, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "artificial wells; Earth; extraction; Lagoon; land
subsidence; modelling; piezometric level; soil;
Venetian; vertical consolidation; water",
treatment = "P Practical",
}
@Article{Nagy:1972:NCC,
author = "G. Nagy and J. Tolaba",
title = "Nonsupervised crop classification through airborne
multispectral observations",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "138--153",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7630 (Avionic systems and aerospace
instrumentation)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "accuracy; aerospace instrumentation; agriculture;
categorizer; clustering algorithm; parameters; primary
sampling units; terrain classification; training sets",
treatment = "P Practical",
}
@Article{Peterson:1972:ICG,
author = "T. I. Peterson and P. N. Wahi",
title = "Interactive computer-based game for decision-making in
ecology",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "154--161",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7490 (Computing in other engineering fields)",
corpsource = "IBM, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computers; computing, management science; decision
making; decision theory and analysis; Ecology Decision
Game; engineering applications of; game theory;
learning; management science; maximal flow; solid waste
management; transportation",
treatment = "T Theoretical or Mathematical",
}
@Article{Shieh:1972:AQD,
author = "L. J. Shieh and P. K. Halpern and B. A. Clemens and H.
H. Wang and F. F. Abraham",
title = "Air quality diffusion model: application to {New York
City}",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "162--170",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4160 (Numerical integration and differentiation)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air pollution diffusion model; air quality;
formulation; Gaussian plume; integration; modelling;
numerical methods; pollution; source strengths",
treatment = "P Practical; X Experimental",
}
@Article{Shir:1972:NIA,
author = "C.-C. Shir",
title = "Numerical investigation of the atmospheric dispersion
of stack effluents",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "171--178",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4170 (Differential equations)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "atmospheric dispersion; finite difference method;
gradient transfer theory; numerical method; numerical
methods; partial differential equations; pollutant
concentration; pollution; stack effluents; temperature
profiles; wind",
treatment = "P Practical; X Experimental",
}
@Article{Braslau:1972:OEC,
author = "N. Braslau",
title = "Overlap emissivity of {CO$_2$} and {H}$_2$\slash {O}
in the 15- mu m spectral region",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "180--183",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9260 (Lower atmosphere)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "absorption; atmospheric composition; atmospheric
spectra; computer simulation; emissivity; mean
temperature; model atmospheres; pressure; radiative
transfer; spectra; spectral calculation; temperature;
water vapour",
}
@Article{Heller:1972:MCT,
author = "L. G. Heller and W. H. Chang and A. W. Lo",
title = "A model of charge transfer in bucket brigade and
charge-coupled devices",
journal = j-IBM-JRD,
volume = "16",
number = "2",
pages = "184--187",
month = mar,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM, Burlington, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bucket brigade; charge coupled devices; charge motion;
electrode fringe field; field effect devices; induced
drift; metal-insulator-semiconductor devices;
modelling; self; thermal diffusion",
treatment = "P Practical",
}
@Article{Chen:1972:MFA,
author = "W. T. Chen and T. F. Flavin",
title = "Mechanics of film adhesion: Elastic and
elastic-plastic behavior",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "203--213",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A6860 (Physical properties of thin films,
nonelectronic); A8100 (Materials science); B0530
(Metals and alloys (engineering materials science));
B0560 (Polymers and plastics (engineering materials
science))",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; analytical model of steady state peeling;
elastic peel films; elastic plastic behaviour; films;
mechanics of film adhesion; rigid substrate; thin
films; viscoelastic adhesive",
treatment = "T Theoretical or Mathematical",
}
@Article{Baumann:1972:VBC,
author = "G. W. Baumann",
title = "Viscoelastic behavior of computer tape subjected to
periodic motion",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "214--221",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0670H (Display, recording, and indicating
instruments); A4630J (Viscoelasticity, plasticity,
viscoplasticity, creep, and stress relaxation); C4290
(Other computer theory); C5320C (Storage on moving
magnetic media)",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "behaviour; boundary conditions; computation theory;
computer tape subjected to periodic motion; high
performance; impedance techniques; longitudinal motion;
magnetic tape storage; mechanical; one dimensional wave
equations; periodic reflected waves; recording; simple
reflected harmonic waves; simple unreflected harmonic
waves; tape drives; travelling velocity stress wave
reflections; vibrations; viscoelastic; viscoelasticity;
waveform analysis",
treatment = "T Theoretical or Mathematical",
}
@Article{Bishop:1972:DCS,
author = "R. E. Bishop and C. C. Wilson",
title = "Dynamic control of spring-driven mechanisms",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "222--230",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7320E (Velocity, acceleration and rotation
measurement); C3120E (Velocity, acceleration and
rotation control); C3260G (Hydraulic and pneumatic
control equipment)",
corpsource = "IBM, Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acceleration control; cylinder; deceleration; dynamic
control; mechanical control equipment; pneumatic
control equipment; single pneumatic; spring driven
mechanisms; velocity control",
treatment = "A Application; P Practical",
}
@Article{Beaty:1972:ICS,
author = "D. A. Beaty and T. A. Hoskins and T. H. Richards and
H. W. Simpson",
title = "{IBM} copier scanning system",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "231--238",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5100 (Electric and magnetic fields)",
corpsource = "IBM, Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; continuously moving; design considerations;
electrostatic devices; electrostatic image; IBM copier
scanning system; image drum; instrumentation;
photoconductor; simulation",
treatment = "P Practical",
}
@Article{Zable:1972:SDC,
author = "J. L. Zable and J. C. Yarrington",
title = "Some design considerations for a document sorting
machine",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "239--248",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3320 (Control applications to materials handling)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design considerations; document sorting machine;
graphical design techniques; indexing time; materials
handling; response time; selector",
treatment = "T Theoretical or Mathematical",
}
@Article{Peterson:1972:ASA,
author = "R. H. Peterson and A. D. Ackerman and R. E. Zelenski",
title = "Acoustic signal analysis for noise source
identification in mechanisms",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "249--257",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4350 (Acoustic noise, its effects and control); B7210
(Instrumentation and measurement systems); B7800
(Sonics and ultrasonics)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acoustic noise; acoustic signal analysis; acoustic
variables measurement; analyzer; frequency; frequency
characteristics; identification; mechanical equipment;
noise source; real time analogue digital signal;
resolution",
treatment = "A Application; P Practical",
}
@Article{Wilson:1972:HID,
author = "A. D. Wilson and D. H. Strope",
title = "Holographic interferometry deformation study of a
printer type-piece",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "258--268",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0340D (Mathematical theory of elasticity); A0760L
(Optical interferometry); A4210J (Optical interference
in homogeneous media); A4220 (Optical propagation and
transmission in inhomogeneous media); A4240
(Holography); A4630C (Elasticity)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Cubic spline; deformation study; effects of impact
velocity; elastic deformation; holographic; holography;
interferometry; light interferometry; methods; print
hammer impact; pulsed ruby laser; stress analysis;
stress information; type piece twisting",
treatment = "X Experimental",
}
@Article{Lin:1972:AWL,
author = "C. Lin and R. F. Sullivan",
title = "An application of white light interferometry in thin
film measurements",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "269--276",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4210 (Optical propagation and transmission in
homogeneous media); A4220 (Optical propagation and
transmission in inhomogeneous media); B7100
(Measurement science); B7200 (Measurement equipment and
instrumentation systems); B7320C (Spatial variables
measurement)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air films; air lubricated slider bearings; colour
spectrum interference pattern; continuous; distance
measurement; equipment; films; light interferometry;
magnetic disk; measurement; micrometers; resolution
0.05; thickness; thin film thickness measurement; thin
films; white light interferometry",
treatment = "A Application; X Experimental",
}
@Article{White:1972:RNI,
author = "J. W. White",
title = "Removal of numerical instability in the solution of
nonlinear heat exchange equations",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "277--282",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0260 (Numerical approximation and analysis); A4400
(Heat flow, thermal and thermodynamic processes);
A4725Q (Convection and heat transfer); C4170
(Differential equations)",
corpsource = "IBM, Winston-Salem, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; coefficient matrices; diagonal dominance;
evolution technique; Gauss Seidel system relaxation
method; heat transfer; Newton Raphson root; nonlinear
differential equations; nonlinear heat exchange
equations; numerical; numerical instability; physics;
relaxation methods; solution of",
treatment = "T Theoretical or Mathematical",
}
@Article{Randolph:1972:DFH,
author = "J. B. Randolph and F. K. King",
title = "Design and fabrication of heat transfer surfaces from
superplastic material",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "283--291",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170G (General fabrication techniques)",
corpsource = "IBM, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; fabrication; flow friction test data; forming
processes; heat sinks; heat transfer surfaces;
material; plastics; superplastic; superplastic sheet
thermoforming process; surface",
treatment = "A Application; N New Development; P Practical",
}
@Article{Paivanas:1972:STP,
author = "J. A. Paivanas",
title = "Stationary temperature profiles and heat flux
distribution in a plastic-encapsulated circuit
package",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "292--302",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2220 (Integrated
circuits); B2570 (Semiconductor integrated circuits)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adiabatic assumptions; axisymmetrical analysis; chip
to lead thermal circuits; dimensional analysis;
encapsulation; flux distribution; heat; heat
dissipation mechanisms; integrated circuits; junction
heat; linear differential equations; one; plastic
encapsulated ICs; plastic to wire thermal circuits;
profiles; sources of equal strength; stationary
temperature profiles; structural integrity; thermal
effects; two dimensional temperature",
treatment = "T Theoretical or Mathematical",
}
@Article{Lindsted:1972:AET,
author = "R. D. Lindsted and D. A. DiCicco",
title = "Analytical and experimental thermal analysis of
multiple heat sources in integrated semiconductor
chips",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "303--306",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits)",
corpsource = "Wichita State Univ. KS, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analytical model; effects; experimental thermal
analysis; integrated circuits; integrated semiconductor
chips; junction temperatures; multiple heat sources;
semiconductor device models; thermal",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Crispi:1972:MMD,
author = "F. J. Crispi and G. C. {Maling, Jr.} and A. W. Rzant",
title = "Monitoring microinch displacements in ultrasonic
welding equipment",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "307--312",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4390 (Other topics in acoustics); B7820 (Sonic and
ultrasonic applications); B8620 (Power applications in
manufacturing industries)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0 to 0.030 inches at LF; 5 to 5000 microinch below 100
KHz; acoustic probe; acoustic variables measurement;
acoustical technique; fiber optic probe; fine;
instruments; length measurement; light reflecting
scheme; microinch displacement monitoring;
noncontacting techniques; optical; ultrasonic
equipment; ultrasonic welding equipment; welding
equipment",
treatment = "X Experimental",
}
@Article{Patlach:1972:DCM,
author = "A. M. Patlach",
title = "Design considerations for a magneto-optic cryogenic
film memory",
journal = j-IBM-JRD,
volume = "16",
number = "3",
pages = "313--319",
month = may,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320Z (Other digital storage)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bearing technology; cryotrons; design considerations;
Fe doped EuO; magnetic storage devices; magnetooptic
cryogenic film memory; operating; optical storage
devices; rotating disk file configuration; technology;
temperature below 100 degrees Kelvin; vacuum",
treatment = "G General Review",
}
@Article{Liniger:1972:SAA,
author = "W. Liniger and F. Odeh",
title = "{$A$}-stable, accurate averaging of multistep methods
for stiff differential equations",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "335--348",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 17:21:09 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290P (Differential equations); C4170 (Differential
equations)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "A-stable; accurate averaging of multistep methods;
algorithmic; computationally efficient; differential
equations; higher-order solutions; implementation;
linear combinations; numerical methods; parameters;
repeated integration; stiff; test problems",
reviewer = "J. C. Butcher",
treatment = "X Experimental",
}
@Article{Gourlay:1972:HDM,
author = "A. R. Gourlay and J. Ll. Morris",
title = "Hopscotch difference methods for nonlinear hyperbolic
systems",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "349--353",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65M05",
MRnumber = "49 \#11820",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290P (Differential equations); C4170 (Differential
equations)",
corpsource = "IBM, Peterlee, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "damping of; differential equations; first; hopscotch
algorithm; hopscotch Lax Wendroff schemes; maximum
stability; nonlinear differential equations; numerical
integration; numerical methods; order nonlinear
hyperbolic systems; partial; partial differential
equations; pseudoviscous term; shocks",
reviewer = "J. C. Butcher",
treatment = "T Theoretical or Mathematical",
}
@Article{Canosa:1972:PSM,
author = "Jos{\'e} Canosa and H. R. Penafiel",
title = "Parallel shooting method for boundary-value problems:
application to the neutron transport equation",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "354--364",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65L10",
MRnumber = "48 \#7610",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0260 (Numerical approximation and analysis); A2820
(Neutron physics); B0290P (Differential equations);
C4170 (Differential equations)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Boltzmann equation; boundary value problems;
boundary-value problems; computation; differential;
equations; geometry; matrix transformations; neutron
transport equations; neutron transport theory;
numerical methods; parallel shooting method; roundoff
instability; slab; spherical harmonics approximation",
treatment = "T Theoretical or Mathematical",
}
@Article{Alsop:1972:FDF,
author = "L. E. Alsop and A. S. Goodman",
title = "Finite difference formulas for {Neumann} conditions on
irregularly shaped boundaries",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "365--371",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65N05",
MRnumber = "48 \#10142",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290P (Differential equations); C4170 (Differential
equations)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "90; and -independent; boundary-value problems; degree
corner; difference equations; elastic surface wave;
finite difference formulas; finite element techniques;
irregularly; methods; Neumann conditions; numerical;
numerical computation; partial differential equations;
propagation; shaped boundaries; time-dependent",
treatment = "T Theoretical or Mathematical",
}
@Article{Micchelli:1972:TFH,
author = "C. A. Micchelli and T. J. Rivlin",
title = "{Tur{\'a}n} formulae and highest precision quadrature
rules for {Chebyshev} coefficients",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "372--379",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D30",
MRnumber = "48 \#12784",
bibdate = "Tue Mar 6 17:23:39 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290M (Numerical integration and differentiation);
C4160 (Numerical integration and differentiation)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Chebyshev coefficients; highest precision quadrature
rules; integration; numerical analysis; polynomials;
Turan formulae",
reviewer = "C. A. Hall",
treatment = "T Theoretical or Mathematical",
}
@Article{Chen:1972:ACE,
author = "Tien Chi Chen",
title = "Automatic Computation of Exponentials, Logarithms,
Ratios and Square Roots",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "380--388",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D20",
MRnumber = "49 \#1738",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "ftp://garbo.uwasa.fi/pc/doc-soft/fpbibl18.zip;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://www.research.ibm.com/journal/rd/164/chen.pdf",
abstract = "It is shown how a relatively simple device can
evaluate exponentials, logarithms, ratios and square
roots for fraction arguments, employing only shifts,
adds, high-speed table lookups, and bit counting. The
scheme is based on the cotransformation of a number
pair $(x, y)$ such that the $F(x, y) = f(x_0)$ is
invariant; when $x$ is driven towards a known value
$x_w$, $y$ is driven towards the result. For an $N$-bit
fraction about $N / 4$ iterations are required, each
involving two or three adds; then a termination
algorithm, based on an add and an abbreviated multiply,
completes the process, for a total cost of about one
conventional multiply time. Convergence, errors and
simulation using APL are discussed.",
acknowledgement = ack-nhfb # " and " # ack-nj,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5230 (Digital arithmetic methods)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adds; APL; bit counting; convergence;
cotransformation; digital arithmetic; errors;
exponentials; high speed table; iteration; logarithms;
lookups; ratios; shifts; simulation; square roots;
termination algorithm",
reviewer = "F. Gotze",
treatment = "P Practical",
}
@Article{Miranker:1972:EIS,
author = "W. L. Miranker",
title = "Enveloping an iteration scheme",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "389--392",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65F10",
MRnumber = "49 \#10132",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290H (Linear algebra); C4140 (Linear algebra)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "enveloping; iteration; iterative methods; linear;
matrix algebra; optimal values; optimisation;
relaxation parameters; second order method",
reviewer = "D. M. Young, Jr.",
treatment = "T Theoretical or Mathematical",
}
@Article{Bosarge:1972:NPM,
author = "W. E. {Bosarge, Jr.} and C. L. Smith",
title = "Numerical properties of a multivariate {Ritz--Trefftz}
method",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "393--400",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65N30",
MRnumber = "49 \#1798",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290F (Interpolation and function approximation);
C1340J (Distributed parameter control systems); C4130
(Interpolation and function approximation)",
corpsource = "IBM, Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "band structure; computer implementation; continuous
approximations; definiteness; distributed parameter
systems; linear parabolic regulator problem;
multivariate splines; numerical properties; Ritz;
splines (mathematics); Trefftz algorithm",
reviewer = "Hansgeorg Jeggle",
treatment = "T Theoretical or Mathematical",
xxtitle = "Numerical properties of a multivariable
{Ritz--Trefftz} method",
}
@Article{Rissanen:1972:REP,
author = "J. Rissanen",
title = "Recursive evaluation of {Pad{\'e}} approximants for
matrix sequences",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "401--406",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D15",
MRnumber = "49 \#1736",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290H (Linear algebra); C4140 (Linear algebra)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; approximants; inverse of the characteristic
matrix; matrix algebra; matrix sequences; minimal;
numerical analysis; Pade; polynomial; polynomials;
recursive evaluation",
reviewer = "Gerhard Merz",
treatment = "T Theoretical or Mathematical",
}
@Article{Wolfe:1972:CGM,
author = "Philip Wolfe",
title = "On the convergence of gradient methods under
constraint",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "407--411",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "49D10 (65K05)",
MRnumber = "48 \#9511",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); C1180 (Optimisation
techniques)",
corpsource = "IBM Thomas J. Watson, Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "convergence of gradient methods; convergence of
numerical methods; example; inequality constraints;
mathematical programming; maximizing; theorem",
reviewer = "V. Komkov",
treatment = "T Theoretical or Mathematical",
}
@Article{Hoffman:1972:FAS,
author = "A. J. Hoffman and S. Winograd",
title = "Finding all shortest distances in a directed network",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "412--414",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "49 \#10454",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290H (Linear algebra); C4140 (Linear algebra)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; directed network; matrix algebra; numerical
analysis; shortest distances",
reviewer = "W.-K. Chen",
treatment = "P Practical",
}
@Article{Tomlin:1972:MSI,
author = "J. A. Tomlin",
title = "Maintaining a sparse inverse in the simplex method",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "415--423",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90C05",
MRnumber = "48 \#7966",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); C1180 (Optimisation
techniques)",
corpsource = "Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "advantages; analytical comparison; elimination form
of; inverse; linear; linear programming; programming;
simplex method; sparse inverse; sparse matrices;
sparseness; speed",
treatment = "T Theoretical or Mathematical",
}
@Article{Guignard:1972:MAK,
author = "M. M. Guignard and K. Spielberg",
title = "Mixed-integer algorithms for the (0,1) knapsack
problems",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "424--430",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); C1180 (Optimisation
techniques)",
corpsource = "Univ. Lille, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "comparative study; computational results; enumerative
algorithms; inequalities; integer programming; knapsack
problem; mixed integer algorithms; search procedures;
state enumeration",
treatment = "T Theoretical or Mathematical",
}
@Article{Guignard:1972:MNC,
author = "M. M. Guignard and K. Spielberg",
title = "Mixed-integer algorithms for the $(0,\,1)$ knapsack
problem",
journal = j-IBM-JRD,
volume = "16",
number = "??",
pages = "424--430",
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90C10",
MRnumber = "48 \#7970",
bibdate = "Wed Dec 4 15:59:35 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Crowder:1972:LCC,
author = "Harlan Crowder and Philip Wolfe",
title = "Linear convergence of the conjugate gradient method",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "431--433",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65K05",
MRnumber = "48 \#10103",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); C1180 (Optimisation
techniques)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "conjugate gradient method; continued method;
convergence of numerical methods; convex; general
nonlinear function; linear convergence; mathematical
programming; nonlinear function; quadratic function;
restarted method",
reviewer = "James T. Wong",
treatment = "T Theoretical or Mathematical",
}
@Article{Brent:1972:DBM,
author = "R. P. Brent",
title = "On the {Davidenko-Branin} Method for Solving
Simultaneous Nonlinear Equations",
journal = j-IBM-JRD,
volume = "16",
number = "4",
pages = "434--436",
month = jul,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65H10",
MRnumber = "48 \#12817",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Mathematics of numerical computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290K (Nonlinear and functional equations); C4150
(Nonlinear and functional equations)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "convergence of numerical methods; convergent;
Davidenko Branin method; example; function
minimization; globally; homeomorphic to; hyperplanes;
nlop; nonlinear equations; simultaneous nonlinear
equations",
reviewer = "N. N. Abdelmalek",
treatment = "T Theoretical or Mathematical",
}
@Article{Burge:1972:CPC,
author = "W. H. Burge",
title = "Combinatory programming and combinatorial analysis",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "450--461",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(mathematical); combinatorial analysis; combinatorial
mathematics; combinatorial theory; programming
techniques; programming theory; topology; trees",
treatment = "T Theoretical or Mathematical",
}
@Article{Herz:1972:RCP,
author = "J. C. Herz",
title = "Recursive computational procedure for two-dimensional
stock cutting",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "462--469",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B05 (90C50)",
MRnumber = "53 \#10220",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7490 (Computing in other engineering fields)",
corpsource = "IBM Paris Sci. Centre, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cutting; engineering applications of computers;
optimisation; procedure; recursive computational; two
dimensional stock cutting",
reviewer = "F. Giannessi",
treatment = "T Theoretical or Mathematical",
}
@Article{Ruehli:1972:ICC,
author = "A. E. Ruehli",
title = "Inductance calculations in a complex integrated
circuit environment",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "470--481",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2140 (Inductors and transformers); B2180E
(Connectors); B2220 (Integrated circuits); B2570
(Semiconductor integrated circuits)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complex integrated circuit environment; design;
inductance; inductances; integrated circuits;
multiloop",
treatment = "T Theoretical or Mathematical",
}
@Article{Billingsley:1972:EUS,
author = "D. S. Billingsley",
title = "Existence and uniqueness of the solution to
{Holland}'s equations for a class of multicolumn
distillation systems",
journal = j-IBM-JRD,
volume = "16",
number = "??",
pages = "482--488",
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65H10",
MRnumber = "49 \#1762",
bibdate = "Tue Sep 11 16:26:07 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
reviewer = "W. C. Rheinboldt",
}
@Article{Myers:1972:COC,
author = "H. J. Myers",
title = "Compiling optimized code from decision tables",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "489--503",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "decision tables; optimisation; procedural code
conversion; program compilers; reviews",
treatment = "G General Review",
}
@Article{Branin:1972:WCM,
author = "F. H. {Branin, Jr.}",
title = "Widely convergent method for finding multiple
solutions of simultaneous nonlinear equations",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "504--522",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65H10",
MRnumber = "54 \#6488",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290K (Nonlinear and functional equations); C4150
(Nonlinear and functional equations)",
corpsource = "IBM, Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "convergent method; differential equations; multiple
solutions; nonlinear equations; numerical methods;
simultaneous nonlinear equations; widely",
treatment = "T Theoretical or Mathematical",
}
@Article{Pugacz-Muraszkiewicz:1972:DDP,
author = "I. J. Pugacz-Muraszkiewicz",
title = "Detection of discontinuities in passivating layers on
silicon by {NaOH} anisotropic etch",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "523--529",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7360H (Electronic properties of insulating thin
films); A8115 (Methods of thin film deposition); A8160
(Corrosion, oxidation, etching, and other surface
treatments); B0520 (Thin film growth); B2550
(Semiconductor device technology)",
corpsource = "IBM, Burlington, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "defects; discontinuities detection; etching; glass;
insulating thin films; passivating layers; quartz;
semiconductor; silicon; sodium compounds; sputtering;
thermally grown oxide films; thin films",
treatment = "X Experimental",
}
@Article{Ziegler:1972:NBA,
author = "J. F. Ziegler and M. Berkenblit and T. B. Light and K.
C. Park and A. Reisman",
title = "Nuclear backscattering analysis of {Nb--Nb$_2$\slash
O$_5$--Bi} structure",
journal = j-IBM-JRD,
volume = "16",
number = "5",
pages = "530--535",
month = sep,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340R (Metal-insulator-metal structures); B2180B
(Relays and switches); B2530G (Metal-insulator-metal
and metal-semiconductor-metal structures)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "metal-insulator-metal structures; niobium compounds;
particle backscattering; semiconductor switches;
thermal effects; thin films",
treatment = "P Practical",
}
@Article{Ungerbroeck:1972:TSC,
author = "G. Ungerbroeck",
title = "Theory on the speed of convergence in adaptive
equalizers for digital communications",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "546--555",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6240Z (Other transmission line links)",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adaptive; convergence; convergence properties; digital
communication; digital communication systems;
distortion; electric; equalisers; mean square
distortion; telephone networks",
treatment = "P Practical",
}
@Article{Sha:1972:NCA,
author = "R. T. Sha and D. T. Tang",
title = "A new class of automatic equalizers",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "556--566",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6240 (Transmission line links and equipment)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic control; automatic equalisers; distortion;
electric distortion; equalisers; fast convergence;
feedback; iterative procedure; truncation error",
treatment = "P Practical",
}
@Article{Moore:1972:CMC,
author = "F. R. Moore",
title = "Computational model of a closed queuing network with
exponential servers",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "567--572",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1220 (Simulation, modelling and identification)",
corpsource = "IBM Corp. Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "closed queuing network; Gordon and Newell approach;
modelling; multiserver queueing station; networks;
queueing theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Michaud:1972:EIE,
author = "P. Michaud",
title = "Exact implicit enumeration method for solving the set
partitioning problem",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "573--578",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "418.05007",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); C1160
(Combinatorial mathematics)",
corpsource = "IBM World Trade Corp., Paris, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "exact implicit enumeration method; set partitioning
problem; set theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Pool:1972:OSA,
author = "J. A. van der Pool",
title = "Optimum storage allocation for initial loading of a
file",
journal = j-IBM-JRD,
volume = "16",
number = "??",
pages = "579--586",
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "403.68033",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{vanderPool:1972:OSA,
author = "J. A. {van der Pool}",
title = "Optimum Storage Allocation for Initial Loading of a
File",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "579--586",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "IBM Nederland, Amsterdam, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "access storage device; direct; file; file
organisation; initial loading; optimisation; optimum
storage allocation; storage allocation;
transformations",
treatment = "G General Review",
}
@Article{Beausoleil:1972:MBM,
author = "W. F. Beausoleil and D. T. Brown and B. E. Phelps",
title = "Magnetic bubble memory organization",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "587--591",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320E (Storage on stationary magnetic media)",
corpsource = "IBM Corp. Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data storage; magnetic bubble memory organization;
magnetic domains; magnetic film stores",
treatment = "P Practical",
}
@Article{Schuessler:1972:DWS,
author = "P. W. H. Schuessler and H. G. Peters and R. M.
Poliak",
title = "Development of water-soluble systems for use in
industrial soldering processes",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "592--597",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170G (General fabrication techniques)",
corpsource = "IBM, Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; development; industrial soldering processes;
joining processes; soldering; water soluble fluxes;
water soluble system",
treatment = "G General Review",
}
@Article{Weeks:1972:MTT,
author = "W. T. Weeks",
title = "Multiconductor transmission-line theory in the {TEM}
approximation",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "604--611",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5240 (Transmission line theory)",
corpsource = "IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "capacitance; inductance; Maxwell's equations;
multiconductor transmission line; TEM propagation;
theory; transmission line theory; uniform perfect
dielectric",
treatment = "T Theoretical or Mathematical",
}
@Article{Dubrulle:1972:SCS,
author = "A. A. Dubrulle",
title = "Solution of the Complete Symmetric Eigenproblem in a
Virtual Memory Environment",
journal = j-IBM-JRD,
volume = "16",
number = "6",
pages = "612--616",
month = nov,
year = "1972",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "405.65013",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290H (Linear algebra); C4140 (Linear algebra); C6120
(File organisation); C7310 (Mathematics computing)",
corpsource = "IBM Corp., Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "allocation; BASIC software paging; complete symmetric
eigenproblem; eigenvalues and eigenfunctions; file
organisation; matrices; nla, eig, performance,
symmetric matrix; storage; storage management;
tridiagonalization; virtual memory environment",
treatment = "P Practical",
}
@Article{Kennedy:1973:SSM,
author = "D. P. Kennedy and P. C. Murley",
title = "Steady state mathematical theory for the insulated
gate field effect transistor",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "2--12",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "field effect transistors; insulated gate field effect
transistor; mathematical analysis; two dimensional",
treatment = "T Theoretical or Mathematical",
}
@Article{Chang:1973:CIA,
author = "W. Chang",
title = "Computer interference analysis",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "13--26",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50 (60K30)",
MRnumber = "51 \#4758",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; computer congestion; computer interference
analysis; operating systems (computers); queueing
theory; queuing time distribution",
reviewer = "F. G. Foster",
treatment = "T Theoretical or Mathematical",
}
@Article{vanderPool:1973:OSAa,
author = "J. A. {van der Pool}",
title = "Optimum Storage Allocation for a File in Steady
State",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "27--38",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "50 \#9083",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "IBM, Amsterdam, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "file organisation; loading factors; maintenance;
optimum storage allocation; storage allocation",
reviewer = "Derick Wood",
treatment = "T Theoretical or Mathematical",
}
@Article{Price:1973:TPS,
author = "P. J. Price",
title = "Transport properties of the semiconductor
superlattice",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "39--46",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220D (General theory, scattering mechanisms
(semiconductors/insulators))",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bloch resonance; carrier mobility; Esaki superlattice;
methods; Monte Carlo methods; negative differential
mobility; semiconductor superlattice Monte Carlo;
semiconductors; transport properties",
treatment = "T Theoretical or Mathematical",
}
@Article{Hellwarth:1973:DCH,
author = "G. A. Hellwarth and S. Boinodiris",
title = "Digital-to-analog converter having common-mode
isolation and differential output",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "54--60",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1290 (Other analogue circuits); C5180 (A/D and D/A
convertors)",
corpsource = "IBM, Boca Raton, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; D/A convertors; data acquisition;
digital-analogue conversion; IBM system/7 computer;
real time automation; real-time; systems",
treatment = "A Application",
}
@Article{Rutz:1973:ASM,
author = "R. F. Rutz and E. P. Harris and J. J. Cuomo",
title = "An {AlN} switchable memory resistor capable of a
{20-MHz} cycling rate and 500-picosecond switching
time",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "61--5",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560F (Bulk effect devices); C5320G (Semiconductor
storage)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "20 MHZ; aluminium compounds; bulk; effect
semiconductor devices; metal-insulator-metal devices;
MIM devices; multistable resistance; operational
characteristics; semiconductor storage devices;
semiconductor switches; sputtering; switching devices",
treatment = "P Practical",
}
@Article{Chaudhari:1973:AMF,
author = "P. Chaudhari and J. J. Cuomo and R. J. Gambino",
title = "Amorphous metallic films for bubble domain
applications",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "66--8",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7530G (Magnetic anisotropy); A7550 (Studies of
specific magnetic materials); A7570K (Domain structure
in magnetic films (magnetic bubbles)); B3110C
(Ferromagnetic materials)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "amorphous metallic films; bubble domain; cobalt
alloys; domains; iron alloys; magnetic; magnetic
anisotropy; magnetic thin films; rare earth alloys",
}
@Article{Kelley:1973:AES,
author = "R. A. Kelley",
title = "{APLGOL}, an experimental structured programming
language",
journal = j-IBM-JRD,
volume = "17",
number = "1",
pages = "69--73",
month = jan,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APLGOL; computer software; experimental structured
programming language; language; procedure oriented
languages; programming",
treatment = "G General Review",
}
@Article{Lewis:1973:EDM,
author = "P. A. W. Lewis and G. S. Shedler",
title = "Empirically derived micromodels for sequences of page
exceptions",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "86--100",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "Naval Postgraduate School, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer; computer program address; empirically
derived micromodels; exceptions; memory hierarchy,
Performance Evaluation: Experimental; models for
program reference patterns; point process of page
exceptions; semi Markov model; sequences of page;
statistical analysis; system; traces; virtual storage",
treatment = "T Theoretical or Mathematical",
}
@Article{Rissanen:1973:BWB,
author = "J. Rissanen",
title = "Bounds for weight balanced trees",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "101--105",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05C05 (90B40 94A30)",
MRnumber = "48 \#5896",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); C1160
(Combinatorial mathematics)",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "entropy; smooth distributions; trees (mathematical);
weight balanced binary tree",
reviewer = "W.-K. Chen",
treatment = "T Theoretical or Mathematical",
}
@Article{vanderPool:1973:OSAb,
author = "J. A. {van der Pool}",
title = "Optimum storage allocation for a file with open
addressing",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "106--114",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "IBM, Amsterdam, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "addressing; cost of retrieval; file organisation; file
organizations; key to address transformation; Markov
model; open; optimum storage allocation; simulation;
simulation method; storage allocation; storage space",
treatment = "P Practical",
}
@Article{Stacy:1973:QLE,
author = "E. W. Stacy",
title = "Quasimaximum likelihood estimators for two-parameter
gamma distributions",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "115--124",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240 (Probability and statistics); C1140 (Probability
and statistics)",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "covariance formula; density function; elementary;
gamma probability distribution; logarithms; new
estimators; probability; statistics; variance
formulas",
treatment = "T Theoretical or Mathematical",
}
@Article{Ferris-Prabhu:1973:TMM,
author = "A. V. Ferris-Prabhu",
title = "Theory of {MNOS} memory device behavior",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "125--134",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); C5320G
(Semiconductor storage)",
corpsource = "IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "characteristic; charge transfer; direct tunnelling
theory; electron traps; fields; high fields; low;
metal-insulator-semiconductor devices; MNOS memory
device; oxide thickness; parameters; semiconductor
storage devices; switching time; total; trap density;
trap distributions; traps; tunnelling; tunnelling
probability",
treatment = "T Theoretical or Mathematical",
}
@Article{More:1973:ATT,
author = "Trenchard {More, Jr.}",
title = "Axioms and theorems for a theory of arrays",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "135--175",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "02K99 (68A05)",
MRnumber = "49 \#2389",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "282.68011",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C5230
(Digital arithmetic methods)",
corpsource = "IBM, Philadelphia, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; APL function of reshaping; array theory; arrays;
axiomatic theory; Cartesian arrays; Cartesian products;
digital arithmetic; empty; operationally transformed
functions; outer transforms; positional; programming;
programming languages; reduction transforms;
replacement operator; separation transforms; set
theory; structure of arrays; theory; transfinite
arithmetic; transforms; vector spaces; Zermelo Fraenkel
set theory",
reviewer = "H. B. Curry",
treatment = "T Theoretical or Mathematical",
}
@Article{Karnaugh:1973:AEH,
author = "M. Karnaugh",
title = "Automatic equalizers having minimum adjustment time",
journal = j-IBM-JRD,
volume = "17",
number = "2",
pages = "176--179",
month = mar,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6240 (Transmission line links and equipment)",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic equalizers; equalisers; lines; minimum
adjustment time; modems; modules; residual distortion;
telephone; telephone lines; upper bounds",
treatment = "N New Development",
}
@Article{Bohlin:1973:CTM,
author = "T. Bohlin",
title = "Comparison of two methods of modeling stationary {EEG}
signals",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "194--205",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8770E (Patient diagnostic methods and
instrumentation); B7510D (Bioelectric signals); C1220
(Simulation, modelling and identification); C7330
(Biology and medical computing)",
corpsource = "IBM Nordic Lab., Lidingo, Sweden",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer aided analysis; electroencephalography;
least; maximum likelihood; modelling; power spectra;
search method; squares approximations; stochastic
processes; total computing effort",
treatment = "A Application; X Experimental",
}
@Article{Chow:1973:XIS,
author = "C. K. Chow and K. E. Niebuhr and S. K. Hilal",
title = "{X}-ray image subtraction by digital means",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "206--218",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8760J (X-rays and particle beams (medical uses));
A8770E (Patient diagnostic methods and
instrumentation); B7510B (Radiation and radioactivity
applications in biomedicine); C7330 (Biology and
medical computing)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer aided analysis; digital processing; medical
radiography; nonlinear; operations; patient diagnosis;
picture; processing; radiography; X-ray applications;
X-ray image subtraction",
treatment = "A Application; P Practical",
}
@Article{Dodge:1973:APM,
author = "F. A. {Dodge, Jr.} and J. W. Cooley",
title = "Action potential of the motorneuron",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "219--229",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8728 (Bioelectricity); A8730C (Electrical activity in
neurophysiological processes); A8730 (Biophysics of
neurophysiological processes); C1290L (Systems theory
applications in biology and medicine)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "action potential; bioelectric potentials; differential
equation; Hodgkin Huxley model; modelling; motorneuron;
nerve fibre partial; neural nets; neurophysiology;
physiological models",
treatment = "T Theoretical or Mathematical",
}
@Article{Friedman:1973:IUP,
author = "H. P. Friedman and J. H. Siegel and R. M. Goldwyn and
E. J. Farrell and M. Miller",
title = "Identifying and understanding patterns and processes
in human shock and trauma",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "230--240",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8770E (Patient diagnostic methods and
instrumentation); B7510 (Biomedical measurement and
imaging); C7330 (Biology and medical computing)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "biomedical measurement; information analysis;
information base; information processing; medical;
multivariable analysis; patient diagnosis; physiologic
measurements",
treatment = "G General Review",
}
@Article{Patrin:1973:PVH,
author = "N. A. Patrin",
title = "Performance of very high density charge coupled
devices",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "241--248",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1260 (Pulse circuits); B1265 (Digital electronics);
B2560S (Other field effect devices); B2570
(Semiconductor integrated circuits); C5120 (Logic and
switching circuits)",
corpsource = "IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "charge-coupled devices; dependency; digital integrated
circuits; fat zero operation; frequency response;
monolithic integrated circuits; performance; registers;
shift; temperature; transfer efficiency; very high
density charge coupled devices",
treatment = "X Experimental",
}
@Article{Ho:1973:TCA,
author = "C. W. Ho",
title = "Theory and computer-aided analysis of lossless
transmission lines",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "249--255",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1150F (Distributed linear networks); B5240
(Transmission line theory); C7410D (Electronic
engineering computing)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "aided analysis; computer; computer-aided circuit
analysis; conductance matrix; distributed parameter;
lossless transmission lines; networks; time-domain
analysis; transmission line theory",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Warnecke:1973:RID,
author = "A. J. Warnecke and P. J. LoPresti",
title = "Refractive index dispersion in semiconductor-related
thin films",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "256--262",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7820D (Optical constants and parameters); A7865
(Optical properties of thin films); A8115 (Methods of
thin film deposition); B0520 (Thin film growth); B2550
(Semiconductor device technology)",
corpsource = "IBM, East Fishkill, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "insulating thin films; LASER-VAMFO interferometer;
photoresists; refractive index; refractive index
dispersion; related thin films; semiconductor;
semiconductor device manufacture",
treatment = "X Experimental",
}
@Article{Chamberlin:1973:ESD,
author = "D. D. Chamberlin and H. P. Schlaeppi and I.
Wladawsky",
title = "Experimental study of deadline scheduling for
interactive systems",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "263--269",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "allocation strategy; deadline scheduling; interactive
systems; operating systems (computers); paging;
resource; scheduling; time slicing strategies; virtual
storage",
treatment = "X Experimental",
}
@Article{Lew:1973:AES,
author = "J. S. Lew",
title = "Asymptotic expansion for small magnetic fields of
acoustoelectric attenuation in nondegenerate
semiconductors",
journal = j-IBM-JRD,
volume = "17",
number = "3",
pages = "270--272",
month = may,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7250 (Acoustoelectric effects (electronic
transport))",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acoustoelectric; acoustoelectric effects; asymptotic
expansion; attenuation; magnetic field effects;
nondegenerate semiconductors; semiconductors; small
magnetic fields",
treatment = "T Theoretical or Mathematical",
}
@Article{Shimizu:1973:NCS,
author = "F. Shimizu",
title = "Numerical calculation of self-focusing and trapping of
a short light pulse in {Kerr} liquids",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "286--298",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4265J (Beam trapping, self focusing, thermal
blooming, and related effects); B4340 (Nonlinear optics
and devices)",
corpsource = "Univ. Tokyo, Bunkyo-Ku, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cutoff radius; dispersion; filament; finite relaxation
time; Kerr; limiting radius; liquids; multimode lasers;
numerical analysis; numerical calculation; parabolic
scalar wave equation; quadratic nonlinear; refractive
index; scattering; self-focusing; short light pulse;
stimulated Raman; trapping; wave equations",
treatment = "T Theoretical or Mathematical",
}
@Article{Peng:1973:EDS,
author = "S. T. Peng and R. Landauer",
title = "Effects of dispersion on steady state electromagnetic
shock profiles",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "299--306",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4110H (Electromagnetic waves: theory); B5210
(Electromagnetic wave propagation)",
corpsource = "Polytech. Inst. Brooklyn, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "dispersion (wave); dispersion requirements;
electromagnetic shock profiles; electromagnetic waves;
models; nonlinear electromagnetic media; nonlinear
transmission line; shock waves; steady state",
treatment = "T Theoretical or Mathematical",
}
@Article{Canosa:1973:NDE,
author = "Jos{\'e} Canosa",
title = "On a nonlinear diffusion equation describing
population growth",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "307--313",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "35Q99 (92A10)",
MRnumber = "48 \#4537",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290K (Nonlinear and functional equations); C4150
(Nonlinear and functional equations)",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "advance of advantageous genes; diffusion; equation;
Fisher's nonlinear diffusion; nonlinear eigenvalue
problem; nonlinear equations; phase plane analysis;
phase space methods; population growth; shock;
shocklike travelling waves; wave equations; waves",
reviewer = "G. L. Lamb, Jr.",
treatment = "T Theoretical or Mathematical",
}
@Article{Gerber:1973:LCP,
author = "P. D. Gerber",
title = "Linearization of {Cauchy}'s problem for quadratic
semilinear partial differential equations",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "314--323",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "35Q99",
MRnumber = "48 \#4538",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "276.35021",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290P (Differential equations); C1310 (Control system
analysis and synthesis methods); C1340J (Distributed
parameter control systems); C4170 (Differential
equations)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Cauchy's problem; disjoint subsystems; hyperbolic
systems; linear algebra; linearisation techniques;
linearization; partial differential equations;
quadratic semilinear",
reviewer = "G. L. Lamb, Jr.",
treatment = "T Theoretical or Mathematical",
}
@Article{Falkoff:1973:DA,
author = "A. D. Falkoff and K. E. Iverson",
title = "The design of {APL}",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "324--334",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
corpsource = "IBM, Philadelphia, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; design process; practicality; principle of;
principle of simplicity; procedure oriented languages;
system management",
treatment = "G General Review",
}
@Article{Ghandour:1973:GAO,
author = "Z. Ghandour and J. Mezei",
title = "General arrays, operators and functions",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "335--352",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "IBM, Philadelphia, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "file organisation; functions; general arrays;
operators; procedure oriented languages",
treatment = "G General Review",
}
@Article{Lathwell:1973:SFA,
author = "R. H. Lathwell",
title = "System formulation and {APL} shared variables",
journal = j-IBM-JRD,
volume = "17",
number = "4",
pages = "353--359",
month = jul,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6150C
(Compilers, interpreters and other processors)",
corpsource = "IBM, Philadelphia, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; APL shared variable system; collections of
autonomous processors; communication with APL programs;
interfaces consisting; of shared variables; procedure
oriented languages; program processors; system
formulation; systems",
treatment = "G General Review",
}
@Article{Delobel:1973:DDB,
author = "C. Delobel and R. G. Casey",
title = "Decomposition of a Data Base and the Theory of
{Boolean} Switching Functions",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "374--386",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "48 \#10233",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See \cite{Delobel:1977:CDD}.",
abstract = "The notion of a fundamental relation among the
attributes of a data set can be fruitfully applied in
the structuring of an information system. These
relations are meaningful both to the user of the system
in his semantic understanding of the data, and to the
designer in implementing the system. An important
equivalence between operations with functional
relations and operations with analogous Boolean
functions is demonstrated in this paper. The
equivalence is computationally helpful in exploring the
properties of a given set of functional relations, as
well as in the task of partitioning a data set into
subfiles for efficient implementation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C4230 (Switching theory); C6120
(File organisation)",
classification = "723; 901",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Boolean functions; Boolean switching functions;
computer metatheory --- Boolean Functions; data base
decomposition; file organisation; information retrieval
systems; switching functions",
reviewer = "J. C. Muzio",
treatment = "T Theoretical or Mathematical",
}
@Article{Bard:1973:CPP,
author = "Y. Bard",
title = "Characterization of Program Paging in a Time-Sharing
Environment",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "387--393",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a method for predicting the
paging behavior of a program in a virtual memory
multiprogramming environment. The effect of overall
system activity on the program is summarized in one
parameter, the page survival index. The model
correlates well with observations taken on programs
running under CP-67. The model can be used for paging
load prediction, simulator input verification, and
evaluation of program rearrangement and sharing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "722; 723",
corpsource = "IBM, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; computer systems,
digital --- Time Sharing; control program 67; file
organisation; load prediction; page; program paging;
simulator input; survival index; time sharing
environment; time-sharing systems; verification;
virtual memory multiprogramming; virtual storage",
treatment = "G General Review; X Experimental",
}
@Article{Silverman:1973:RTC,
author = "H. F. Silverman and P. C. Yue",
title = "Response Time Characterization of an Information
Retrieval System",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "394--403",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A methodology for computer performance evaluation
based on the statistical characterization of response
time is described. The results of its application to an
information retrieval system are presented. The first
part of the paper gives a general discussion of
measurement techniques, data reduction procedures and
the structure of the system being examined. A set of
``system environment'' parameters and a set of ``job''
parameters are then defined and appraised in terms of
actual measurements collected over two different weekly
periods. Various ways of using the statistical
characterization for improving performance are then
considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310 (EDP management); C6150G (Diagnostic, testing,
debugging and evaluating systems); C7250 (Information
storage and retrieval)",
classification = "722; 723; 901",
corpsource = "IBM T. J. Watson Res. Centre, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer performance; computer selection and
evaluation; computer systems, digital ---
Multiprocessing; data acquisition; evaluation;
information retrieval system; information retrieval
systems; response time characterisation",
treatment = "T Theoretical or Mathematical",
}
@Article{Chamberlin:1973:APA,
author = "D. D. Chamberlin and S. H. Fuller and L. Y. Liu",
title = "Analysis of Page Allocation Strategies for
Multiprogramming Systems with Virtual Memory",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "404--412",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a multiprogramming, virtual-memory computing
system, many processes compete for the main storage
page frames and CPU's of the real system. It is
customary to define a subset of these processes called
the ``multiprogramming set'' (MPS), and to allocate
resources only to those processes currently in the MPS.
Each process remains in the MPS for a limited time and
is then demoted. The system paging manager controls the
size of the MPS; it allocates the available page frames
among the processes in the MPS and fetches appropriate
pages into the page frames. A model is described that
assumes the most critical resources of the system to be
page frames and the paging channel (i.e., there is no
significant CPU contention). The model makes certain
assumptions about the page fault rate of processes as a
function of page frames allocated, and about the page
fetch time as a function of mean load on the paging
channel. The model also incorporates a definition of
the value of a given page allocation in terms of system
throughput. The model is used to study various
strategies for choosing an MPS and allocating page
frames among processes. For simple cases, the model
yields an exact optimal strategy. A heuristic strategy
is proposed for dealing with more complex cases, and is
shown by the model to be reasonably near optimal. The
heuristic strategy monitors the page fault rate of each
process and chooses an allocation such that each
process can be executed at a reasonable rate, while
ensuring that the paging channel is neither overloaded
nor underloaded.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "722",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; multiprogramming;
multiprogramming systems; page allocation strategies;
virtual memory; virtual storage",
treatment = "T Theoretical or Mathematical",
}
@Article{Kobayashi:1973:DRC,
author = "H. Kobayashi and D. T. Tang",
title = "Decision-Feedback Receiver for Channels with Strong
Intersymbol Interference",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "413--419",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with the problem of equalizing
channels containing strong intersymbol interference.
Typical of such channels are those of digital magnetic
recording systems and data communication systems with
partial-response signaling. First the authors discuss
reasons that a conventional receiver with a linear
equalizer cannot efficiently compensate for distortion
in such channels. They then present a new receiver
configuration in which the equalizer and quantizer are
embedded in an inverse filter circuit that eliminates
major intersymbol interference components. This
configuration allows them to use a simple iteration
algorithm to adaptively adjust the equalizer.
Application of the scheme to digital magnetic recording
data is discussed as an illustrative example.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B6240
(Transmission line links and equipment); C1260
(Information theory)",
classification = "716",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data communication systems; data transmission;
decision; digital communication systems; digital
magnetic recording; distortion; equalisers; feedback
receiver; interference; intersymbol interference;
linear equaliser; magnetic recording; quantiser;
receivers; systems",
treatment = "N New Development; P Practical",
}
@Article{Donath:1973:LBP,
author = "W. E. Donath and A. J. Hoffman",
title = "Lower Bounds for the Partitioning of Graphs",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "420--425",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05C99",
MRnumber = "48 \#8304",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Graphs were generated by connecting a preset number of
vertices with some probability p, and removing
unconnected vertices from the graph. Results are given
for graphs having 20, 40, 60, and 100 nodes; the ratio
$B_U/B_L$ is computed for each graph and averaged over
all graphs of each of the various sets of equal size.
It can be seen that this ratio which is about 1.6 for
many of the cases, gives a reasonable range. Pertinent
to the problem of computer logic partitioning.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); C1160
(Combinatorial mathematics); C4290 (Other computer
theory)",
classification = "722",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "classification; computation theory; computer logic;
computer programs; computer systems, digital; graph
theory; graphs partitioning; lower bounds; nodes;
paging; partitioning",
reviewer = "Moshe Rosenfeld",
treatment = "T Theoretical or Mathematical",
}
@Article{Matthews:1973:DGG,
author = "J. W. Matthews and E. Klokholm and T. S. Plaskett",
title = "Dislocations in gadolinium gallium garnet
({Gd$_3$Ga$_5$O$_{12}$}). {III}. Nature of prismatic
loops and helical dislocations",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "426--429",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Thin garnet films suitable for magnetic bubble devices
can be made by depositing the film material onto
nonmagnetic garnets such as {Gd$_3$Ga$_5$O$_1$}$_2$
(GGG). The performance of these devices is influenced
by the dislocation content of the films. This, in turn,
depends on the dislocation content of the substrate.
Dislocations in the substrate can be detected by means
of the birefrigence they induce, or from the etch pits
formed where they meet the sample surface. Most of the
dislocations revealed by these techniques have been
climb loops around inclusions and helical dislocations.
This paper describes an optical method for determining
the sign of the stresses at inclusions and nature of
loops and helical dislocations. The method has shown
that iridium inclusions are compressed by the matrix
and that the loops and helices in GGG are extrinsic;
they grow either by the emission of vacancies or the
absorption of interstitial atoms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170 (Defects in crystals); B3120L (Magnetic bubble
domain devices); B3120N (Magnetic thin film devices);
B3120 (Magnetic material applications and devices)",
classification = "708; 933",
corpsource = "IBM Thomas J. Watson, Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "birefringence; crystals --- Defects; dislocations;
film devices; gadolinium compounds; gadolinium gallium
garnet; garnets; helical; magnetic bubble devices;
magnetic materials; magnetic thin; prismatic loops;
substrates",
treatment = "X Experimental",
}
@Article{Critchlow:1973:DCN,
author = "D. L. Critchlow and R. H. Dennard and S. E. Schuster",
title = "Design and characteristics of $n$-channel
insulated-gate field-effect transistors",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "430--442",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An n-channel insulated-gate field-effect transistor
technology established at IBM Research has served as
the basis for further development leading to FET
memory. Designs and characteristics of experimental
devices of 500 and 1000 A gate insulator thicknesses
are presented, with particular attention to the effects
of source-drain spacing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); C5320G
(Semiconductor storage)",
classification = "714",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "characteristics; design; field effect transistors;
IGFET; memory; n-channel; semiconductor; semiconductor
storage devices; surface drain spacing; transistors,
field effect",
treatment = "P Practical",
}
@Article{Magdo:1973:TOS,
author = "S. Magdo",
title = "Theory and Operation of Space-Charge-Limited
Transistors with Transverse Injection",
journal = j-IBM-JRD,
volume = "17",
number = "5",
pages = "443--458",
month = sep,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The development of a new device, called the
space-charge-limited (SCL) transistor with transverse
injection is reported in this paper. A theoretical
model for space-charge-limited transistors, both npn
and pnp, on high-resistivity silicon substrates, is
described and a quantitative analysis is given.
Experimental results for SCL transistors are presented
to support the model's validity. According to the
model, current in SCL transistors is controlled by the
base of a parallel-connected lateral transistor in two
ways. First, the base of the parallel transistor
controls the potential step in the high resistivity
base of the SCL transistor. Second, the base of the
parallel transistor injects carriers in the direction
transverse to the SCL current flow. These carriers are
of types opposite to those that carry the current flow
in the SCL transistor and thus partly neutralize the
space-charge in the current flow. The carriers
propagate, predominantly by drift, across the
high-resistivity base region of the SCL transistor. The
resulting base transit time is about two orders of
magnitude faster than that of a bipolar transistor with
equal base width. No charge storage takes place in
saturation. These features and the very low device
capacitances make the SCL transistor attractive for
low-power, fast-switching applications. Current gains
as high as 70,000 are obtained at low current levels.
The current gain decreases at higher current levels
because the parallel lateral transistor turns on. It is
also demonstrated that complementary pairs of SCL
transistors can be fabricated with three masking steps,
including metalization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors)",
classification = "714",
corpsource = "IBM, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar transistors; charge; fast switching
applications; metallisation; operation; semiconductor
device models; space; space charge limited;
space-charge-limited transistors; transistors;
transverse injection",
treatment = "N New Development; P Practical; X Experimental",
}
@Article{Hauge:1973:DOE,
author = "P. S. Hauge and F. H. Dill",
title = "Design and operation of {ETA}, an automated
ellipsometer (f.e.t. gate insulator thickness
measurement)",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "472--489",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design and operational features are described for
a computer-assisted ellipsometer (called ETA for
Ellipsometric Thickness Analyzer), developed to provide
reliable, real-time measurement of field-effect
transistor gate insulator thickness in a manufacturing
environment. ETA illuminates the sample with light of
fixed polarization and uses a rotating analyzer to
measure the polarization of the reflected light. Sample
alignment is done automatically by ETA, so that usually
no operator adjustments are required. Fourier analysis
of the light transmitted by the analyzer is used to
reduce noise and enhance measurement precision. In its
normal mode of operation ETA can measure single and
double-layer films of SiO$_2$ and Si$_3$N$_4$ in the
thickness range of 300 to 800 A with precision
comparable to that of conventional ellipsometers. Other
modes of operation, which make use of a fixed-position
compensator in the incident light path, allow precise
measurement of thin films (0 to 300 A) and permit use
of ETA as a general-purpose ellipsometer. The typical
time interval required for wafer alignment, data
acquisition, analysis and recorded output of film
thickness is about five seconds, and the measurement
reproducibility is typically about 1 A.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650 (Data handling and computation); A0670E (Testing
equipment); A0670T (Servo and control devices); A0760F
(Optical polarimetry and ellipsometry); B2560S (Other
field effect devices); C3380D (Control of physical
instruments); C7410D (Electronic engineering
computing)",
classification = "714; 941",
corpsource = "IBM, New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automated ellipsometer; automatic test
equipment; computer aided analysis; computer assisted
ellipsometer; control; data reduction and; electronics
applications of computers; ellipsometers; ellipsometry;
engineering applications of computers; FET; field
effect transistors; films; gate insulator thickness
measurement; optical instruments; polarimeters;
semiconductor device manufacture; thickness
measurement",
treatment = "A Application; P Practical",
}
@Article{Kallmeyer:1973:RPC,
author = "M. Kallmeyer and K. Kosanke and F. Schedewie and B.
Solf and D. Wagner",
title = "Rapid, Precise, Computer-Controlled Measurement of
{X-Y} Coordinates",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "490--499",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An experimental x-y measurement system is described
that was designed for the high-speed, high-precision
measurements required in integrated circuit
manufacturing and for optical measurement applications
in which a sufficiently large data base is required for
statistical process analysis. The technology for this
experimental system differs considerably from that of
conventional optical measuring systems in current use
and utilizes a computer for data acquisition,
manipulation and evaluation. The system, utilizing the
edge detection principle, presently operates at a
measuring speed of 2.5 cm/s. An analysis gives both the
short-term and the long-term precision of the system.
The standard deviation for the short-term precision is
0.038 $\mu$ m.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0650 (Data
handling and computation); A0670T (Servo and control
devices); A0760P (Optical microscopy); B2220
(Integrated circuits); B2570 (Semiconductor integrated
circuits); C3380D (Control of physical instruments);
C7410D (Electronic engineering computing)",
classification = "713",
corpsource = "IBM Deutschland GmBH, Sindelfingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "applications; automatic control; computer; computers;
control engineering applications of; controlled
measurement; data acquisition; data reduction and
analysis; electronics applications of computers;
integrated circuit; integrated circuit manufacture;
integrated circuit manufacturing; microscopy; optical
measurement; position measurement; production;
statistical process analysis; XY coordinate
measurement",
treatment = "A Application; P Practical",
}
@Article{Schechtman:1973:IUT,
author = "B. H. Schechtman and S. S. So and E. W. Luttman",
title = "Interactive Use of a Time-Shared Process Control
Computer in Electrophotographic Sensitometry",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "500--508",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The usefulness of electrophotographic exposure
sensitometry as means of characterizing and evaluating
new photoconductor materials has been extended by
coupling the experiment to an on-line computer. This
automated system provides several new functional
capabilities not realistically attainable in manual
operation and drastically reduces the time lag in the
exchange of information between research workers who
prepare materials and those who evaluate the materials.
These various improvements have been achieved by
extensive use of interactive graphic techniques and a
user-oriented data-base organization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650 (Data handling and computation); A0670T (Servo
and control devices); A0768 (Photography, photographic
instruments and techniques); C3370N (Control
applications in photography and cinematography); C3380D
(Control of physical instruments); C7490 (Computing in
other engineering fields)",
classification = "731; 732; 742; 745",
corpsource = "San Jose Res. Lab., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automated system; automatic control; data
acquisition; data reduction and; electrophotographic
sensitometry; electrophotography; interactive use;
photographic material; photographic reproduction ---
Electrostatic; process control; sensitivity; shared
process control computer; time",
treatment = "A Application; P Practical",
}
@Article{Flamholz:1973:DMD,
author = "A. L. Flamholz and H. A. Froot",
title = "Dimensional Measurement and Defect Detection Using
Spatial Filtering",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "509--518",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new method is described that utilizes coherent
bandpass spatial filtering and subsequent superposition
to form filtered images in which small differences in
size and geometry of the original object are readily
detected. The theoretical basis is discussed and
experiments described in which signal ratios of about
10:1 are obtained for a diameter change of 2.5 percent
of a clear circular disk. The method is used to process
in parallel a 57-mm evaporation mask containing 12,000
holes, each being 0.1 mm in diameter. The size of each
hole is accurately gaged and small imperfections are
indicated in the filtered image.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4280C (Spectral and other filters); B2220 (Integrated
circuits); B2570 (Semiconductor integrated circuits)",
classification = "723; 741",
corpsource = "IBM, East Fishkill, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data processing; defect detection; dimensional
measurement; evaporation masks; fault location;
filtering; information processing; masks; micrometry;
optical; optical data processing; optical filters;
optics; spatial",
treatment = "A Application; P Practical",
}
@Article{Chastang:1973:OTM,
author = "J. C. Chastang",
title = "Optical Techniques for Measurement of Chamber
Spacing",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "519--524",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Two optical methods were investigated for accurately
measuring the gap, or chamber spacing, that separates
two closely spaced transparent plates. The first method
uses a special microscope in which the main feature is
a unit-magnification catadioptric system that gives an
aberration-free image of the chamber outside the
plates, where it is accessible to a high-power
objective. The second method is based upon the light
section principle, whereby the image of a slit is
projected onto the boundaries of the chamber and is
thus doubled. The reflected images are observed with a
microscope and the degree of separation, which is
proportional to the chamber spacing, is measured.
Accuracy better than 2 $\mu$ m is obtained for the two
techniques. The choice of the appropriate method
depends on the surface quality of the chamber
boundaries.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0760P (Optical microscopy)",
classification = "741; 943",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chamber spacing measurement; closely spaced
transparent plates; distance measurement; mechanical
variables measurement --- Distance; microscopy; optical
techniques; optics",
treatment = "P Practical",
}
@Article{Bennett:1973:LRC,
author = "C. H. Bennett",
title = "Logical Reversibility of Computation",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "525--532",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A25",
MRnumber = "56 \#7325",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "267.68024",
abstract = "The usual general-purpose computing automation (e.g.,
a Turing machine) is logically irreversible --- its
function lacks a single-valued inverse. Here it is
shown that such machines may be made logically
reversible at every step, while retaining their
simplicity and their ability to do general
computations. This result is of great physical interest
because it makes plausible the existence of
thermodynamically reversible computers which could
perform useful computations at useful speed while
dissipating considerably less than kT of energy per
logical step. In the first stage of its computation the
logically reversible automaton parallels the
corresponding irreversible automaton, except that it
saves all intermediate results, thereby avoiding the
irreversible operation of erasure. The second stage
consists of printing out the desired output. The third
stage then reversibly disposes of all the undesired
intermediate results by retracing the steps of the
first stage in backward order (a process which is only
possible because the first stage has been carried out
reversibly), thereby restoring the machine (except for
the now-written output tape) to its original condition.
The final machine configuration thus contains the
desired output and a reconstructed copy of the input,
but no other undesired data. The foregoing results are
demonstrated explicitly using a type of three-tape
Turing machine. The biosynthesis of messenger RNA is
discussed as a physical example of reversible
computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4220 (Automata theory)",
classification = "723",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automata theory; computation; computer metatheory;
computing automaton; logical reversibility; Turing
machine",
treatment = "T Theoretical or Mathematical",
}
@Article{Anderson:1973:APP,
author = "H. A. {Anderson, Jr.}",
title = "Approximating Pre-Emptive Priority Dispatching in a
Multiprogramming Model",
journal = j-IBM-JRD,
volume = "17",
number = "6",
pages = "533--539",
month = nov,
year = "1973",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The formulation of the closed queueing network model
of a multiprogramming computer system is generalized to
allow each task to have its own set of facility service
rates and I/O device selection probability
distribution. In the model, processor sharing is
assumed for different types of customers. It is shown
through a series of investigations that the model
reasonably approximates pre-emptive priority
dispatching.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "723; 922",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(computers); closed queuing network model; computer
systems programming; dispatching; dispatching
approximation; multiprogramming; multiprogramming
computer system; multiprogramming model; operating
systems; preemptive priority; probability --- Queueing
Theory; queueing theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Belady:1974:OMP,
author = "L. A. Belady and F. P. Palermo",
title = "On-line measurement of paging behavior by the
multivalued {MIN} algorithm",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "2--19",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "50 \#6234",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An algorithm is presented that extracts the sequence
of minimum memory capacities (MMCs) from the sequence
of page references generated by a program as it is
executed in a demand paging environment. The new
algorithm combines the advantages of existing
approaches in that the MMC's are produced in a single
pass, as is the output of the MIN algorithm for a
single memory size, and the MMC sequence is identical
to the optimum stack distances provided by the OPT
algorithm, which requires two passes. A hardware
implementation is outlined as an extension to existing
page management mechanisms. The resulting device could
be used to produce continuously the MMC information,
while the (paging) machine executes the program at
essentially full speed. The paper also discusses the
possible impact of the algorithm on the study of
program behavior and on the development of space
sharing (paging) algorithms. Finally, a proof is
provided that the algorithm in fact produces an output
identical to that of OPT.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "capacities; computer programming; demand paging;
hardware; multiprogramming; multivalued MIN algorithm;
online measurement; optimum stack distances; page
management; sequence of minimum memory; sequence of
page references; sharing; space; storage management;
virtual storage",
reviewer = "Richard A. DeMillo",
treatment = "P Practical",
}
@Article{Beatty:1974:RAA,
author = "J. C. Beatty",
title = "Register Assignment Algorithm for Generation of Highly
Optimized Object Code",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "20--39",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "50 \#6201",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A register assignment algorithm is described that, in
contrast to traditional methods, permits a high level
of optimization both local and global levels. This
involves splitting local register optimization into two
phases, with global assignment intervening. Because
novel techniques are used in the global assignment
procedure, it is described in detail. Experimental
results with a prototype implementation are presented
in which object code improvements on the order of 25
percent over a production optimizing compiler were
obtained. No attempt was made to assess manpower costs
of a final implementation nor to weight them against
expected improvements in generated code.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130 (Data handling techniques); C6150C (Compilers,
interpreters and other processors)",
classification = "723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compiler; computer programming; global assignment;
local register optimization; object code improvements;
optimisation; program compilers; register assignment
algorithm; storage allocation",
reviewer = "W. D. Maurer",
treatment = "P Practical",
}
@Article{Lever:1974:WVO,
author = "R. F. Lever and H. M. Demsky",
title = "Water Vapor as an Oxidant in {BBr}$_3$ Open-Tube
Silicon Diffusion Systems",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "40--46",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of water vapor as an oxidant in place of
oxygen enables a wide range of surface concentrations
to be obtained in a single-step process. The
concentration of boron at the silicon surface is found
to be constant throughout the diffusion process
because, at the temperature used, the oxide growth is
not parabolic.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0510 (Crystal growth); B2550 (Semiconductor device
technology)",
classification = "712; 714",
corpsource = "IBM, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "BBr/sub 3/; boron; concentrations; elemental
semiconductors; open; oxide growth; range of surface;
semiconducting silicon --- Doping; semiconductor device
manufacture; semiconductor doping; silicon; silicon
diffusion systems; tube diffusion systems; water vapour
oxidant",
treatment = "A Application",
}
@Article{Chang:1974:PDI,
author = "W. H. Chang and H. S. Lee",
title = "Potential Distribution of an Inhomogeneously Doped
{MIS} Array",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "47--52",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A numerical method is used to obtain the potential
distribution of a two-dimensional, inhomogeneously
doped MIS array under pulse voltage operation. The
effects of interface charge and of impurity doping and
its locations on the surface potential profile are
presented. The technique is useful for designing an
appropriate surface potential profile for ion-implanted
charge-coupled devices.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7320H (Surface impurity and defect levels; energy
levels of adsorbed species); B2550B (Semiconductor
doping); B2560S (Other field effect devices)",
classification = "714",
corpsource = "IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "charge coupled devices; charge-coupled devices;
devices; distribution; impurity doping; inhomogeneously
doped MIS array; interface charge; ion implanted;
metal-insulator-semiconductor; numerical method;
potential; pulse voltage operation; semiconductor
devices, mis; semiconductor doping; surface potential;
surface potential profile",
treatment = "T Theoretical or Mathematical",
}
@Article{Beisner:1974:NCN,
author = "H. M. Beisner",
title = "Numerical Calculation of Normal Modes for Underwater
Sound Propagation",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "53--58",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Hartree's method for calculation of atomic wave
functions is applied to the Schroedinger-like normal
mode equation for underwater sound propagation. Rapid
convergence was obtained for the twelve normal modes at
five Hertz with a typical velocity profile. The normal
modes are given, along with an example of the pressure
field, and a means for numerical calculation of the
near field modes is suggested.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4330 (Underwater sound)",
classification = "751",
corpsource = "IBM, Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "5 Hz; acoustic wave propagation; acoustic waves ---
Transmission; acoustics, underwater; convergence;
convergence of numerical methods; Hartree's method;
Hartree--Fock method; near field modes; normal mode
equation; pressure field; propagation; Schr{\"o}dinger
equation; underwater sound",
treatment = "T Theoretical or Mathematical",
}
@Article{Pistor:1974:SCR,
author = "P. Pistor",
title = "Stability Criterion for Recursive Filters",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "59--71",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A05",
MRnumber = "50 \#4097",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new criterion is derived that relates the stability
of two-dimensional recursive filters to the properties
of its cepstrum. It provides a procedure for the
decomposition of unstable recursive filters having
nonzero, nonimaginary frequency response into stable
recursive filters. The optimal solution of the
decomposition problem is discussed, including numerical
implementation and nonrecursive solutions. Several
numerical examples show the potentialities and
limitations of the rules for decomposition and for
truncation of the operators.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1270 (Filters and other networks); B6140 (Signal
processing and detection); C1260 (Information theory)",
classification = "716; 718; 731",
corpsource = "IBM, Heidelberg, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cepstrum; decomposition problem; digital filters;
filtering and prediction theory; frequency; information
theory; nonrecursive solutions; numerical
implementation; response; stability criteria; stability
criterion; truncation; two dimensional recursive
filters",
reviewer = "P. R. Bryant",
treatment = "T Theoretical or Mathematical",
}
@Article{Agizy:1974:EOS,
author = "M. N. Agizy",
title = "Economic order and surplus quantities model",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "72--5",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290D (Systems theory applications in economics and
business); C1290F (Systems theory applications in
industry); C7160 (Manufacturing and industrial
administration)",
corpsource = "Exxon Corp., Florham Park, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "carrying; charges; demand; economic cybernetics;
economic order and surplus; economic order quantity
model; interest charges; inventory management;
modelling; ordering cost; quantities model; standard
mathematical model; stock control",
treatment = "E Economic; T Theoretical or Mathematical",
}
@Article{ElAgizy:1974:EOS,
author = "M. N. {El Agizy}",
title = "Economic Order and Surplus Quantities Model",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "72--75",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A standard mathematical model for inventory management
is known as the Economic Order Quantity (EOQ) model.
Now, the EOQ model is extended to include the
possibility of determining how much, if any, excess
stock should be sold at the beginning of a decision
period. The new model is of practical importance for
situations in which a formal inventory management
system is to be instituted while substantial
inventories exist or when changes in demand, ordering
cost, or carrying and interest charges require
recomputation of the economic order quantity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "911",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "inventory control",
}
@Article{Das:1974:PLE,
author = "G. Das and N. A. O'Neil",
title = "Preparation of Large-Area Electron-Transparent Samples
from Silicon Devices",
journal = j-IBM-JRD,
volume = "18",
number = "1",
pages = "76--79",
month = jan,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A technique using a pulsating chemical jet has been
developed for thinning and polishing large areas (750
to 1000 $\mu$ m in diameter) of silicon devices. The
thickness can be reduced to a few micrometers. This
technique has been used to prepare bipolar and FET
samples for transmission electron microscopy. Physical
characterization of more than twenty devices can be
achieved by one sample preparation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0660E (Sample preparation); A0670E (Testing
equipment); A0780 (Electron and ion microscopes and
techniques); B0510 (Crystal growth); B2390 (Electron
and ion microscopes); B2550E (Surface treatment for
semiconductor devices); B2550 (Semiconductor device
technology); B2560 (Semiconductor devices)",
classification = "422; 423; 714",
corpsource = "IBM, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar samples; devices; electron microscopy;
electron transparent samples; FET samples; large area;
polishing; preparation; pulsating chemical jet; sample;
semiconductor device; semiconductor devices; silicon;
specimen preparation; testing; thinning; transmission
electron microscopy",
treatment = "P Practical",
}
@Article{DiStefano:1974:IIS,
author = "T. H. DiStefano and J. M. Viggiano",
title = "Interface Imaging by Scanning Internal Photoemission",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "94--99",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A scanning internal photoemission (SIP) technique is
used to obtain a high resolution map or image of the
potential energy barrier at an insulator interface. The
image is produced by displaying the internal
photocurrent produced by a monochromatic beam of light
scanned across the sample. A special technique was
developed for focusing the light to a spot less than
one micrometer in diameter. Photoemission images of a
Si-SiO$_2$ interface ``stained'' with a fractional
monolayer of sodium are presented along with
photoemission and reflectivity images of a
Nb$_2$O$_5$-Bi interface. These SIP images show
inhomogeneities related to structural variations,
impurities, and defects at the interface that
previously were inaccessible to observation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340Q (Metal-insulator-semiconductor structures);
B2530F (Metal-insulator-semiconductor structures)",
classification = "701; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2/O/sub 5/-Bi interface; and defects; direct
microscopic image; insulator boundaries; interface
imaging; Nb/sub; photoemission; potential energy
barrier; scanning internal photoemission;
semiconductor; semiconductor devices;
semiconductor-insulator boundaries; Si-SiO/sub 2/
interface; structural variations, impurities",
treatment = "P Practical; X Experimental",
}
@Article{Huth:1974:CSD,
author = "B. G. Huth",
title = "Calculations of Stable Domain Radii Produced by
Thermomagnetic Writing",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "100--109",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Calculations are performed to determine the stable
radius of a cylindrically symmetric domain nucleated in
magneto-optical films during thermomagnetic writing
with a laser beam. A critical bound on domain size is
calculated which determines whether or not a domain of
given radius, once nucleated, will be stable. The
analysis shows that for a ferromagnetic material such
as MnAlGe, the domain dimensions can grow beyond the
local region of material that is heated above the Curie
temperature. For ferrimagnetic thin films having a
compensation point, T$_{comp}$, stability depends on
the difference between ambient and compensation
temperatures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7570K (Domain structure in magnetic films (magnetic
bubbles)); A7820L (Magneto-optical effects (condensed
matter)); B3120N (Magnetic thin film devices); C5320E
(Storage on stationary magnetic media)",
classification = "701; 721; 741; 744",
corpsource = "IBM., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "calculations of stable domain radii; data storage,
magnetic; ferrimagnetic thin; ferromagnetic material;
films; laser beam; laser beam applications; laser beams
--- Applications; magnetic domains; magnetic film;
magneto optical films; magneto-optical effects;
magnetooptical effects; magnetothermal effects; stores;
thermomagnetic writing",
treatment = "T Theoretical or Mathematical",
}
@Article{Reiser:1974:ADA,
author = "M. Reiser and H. Kobayashi",
title = "Accuracy of the Diffusion Approximation for Some
Queuing Systems",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "110--124",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25",
MRnumber = "51 \#9258",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents the results of a rather extensive
study of the accuracy of the diffusion approximation
technique as applied to queuing models. The motive for
using the diffusion process approximation here is to
develop realistic analytical models of computing
systems by considering service time distributions of a
general form. We first review the theory of the
diffusion approximation for a single server and then
develop a new and simplified treatment of queuing
network system. The accuracy of this approximation
method is then considered for a wide class of
distributional forms of service and interarrival times
and for various queuing models. The approximate
solutions and exact (or simulation) solutions are
compared numerically in terms of the means and
variances of queue sizes, server utilizations, the
asymptotic decrements of the distributions, and the
queue size distributions themselves. The accuracy of
the diffusion approximation is found to be quite
adequate in most cases and is considerably higher than
that obtained by an exponential server model that is
prevalent in computer system modeling.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C6150J (Operating systems)",
classification = "723; 922",
corpsource = "IBM, Zurich, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accuracy; analytical models of computing systems;
asymptotic; computer metatheory; computer system;
continuous path Markov process; decrements; diffusion
approximation; function approximation; Markov
processes; modeling; models; probability; queue size
distributions; queue sizes; queueing theory; queuing
systems; server utilizations; supervisory and executive
programs; various queuing",
reviewer = "D. P. Gaver",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Anderson:1974:ISI,
author = "H. A. {Anderson, Jr.} and R. G. Sargent",
title = "Investigation into Scheduling for an Interactive
Computing System",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "125--137",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Description of a statistical evaluation of the
performance of the swap scheduling algorithm of an
interactive computer system and an investigation into
foreground-background scheduling to improve system
performance. Input traffic, computer service time
demands, and system performance were statistically
analyzed. Based on the results of these analyses
performance enhancements for the system were determined
and then evaluated through use of a validated
simulation model.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; computer service time demands; computer
systems, digital; foreground background; input traffic;
interactive computing system; operating systems
(computers); performance; scheduling; simulation model;
statistical; statistical analysis; swap scheduling
algorithm; system",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Kogge:1974:PSR,
author = "P. M. Kogge",
title = "Parallel Solution of Recurrence Problems",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "138--148",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D15",
MRnumber = "49 \#6552",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "307.65080",
abstract = "An mth-order recurrence problem is defined as the
computation of the sequence $x_1,\ldots{}, x_N$, where
$x_i$ equals $f(a_i, x_{i-1},\ldots{}, x_{i-m})$ and
$a_i$ is some vector of parameters. This paper
investigates general algorithms for solving such
problems on highly parallel computers. We show that if
the recurrence function f has associated with it two
other functions that satisfy certain composition
properties, then we can construct elegant and efficient
parallel algorithms that can compute all $N$ elements
of the series in time proportional to left bracket
log$_2$N right bracket. The class of problems having
this property includes linear recurrences of all orders
--- both homogeneous and inhomogeneous, recurrences
involving matrix or binary quantities, and various
nonlinear problems involving operations such as
computation with matrix inverses, exponentiation, and
modulo division.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290H (Linear algebra); C4140 (Linear algebra); C7310
(Mathematics computing)",
classification = "723; 921",
corpsource = "IBM, Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "and modulo division; computation with matrix inverses;
computer programming; exponentiation,; linear algebra;
linear recurrences of all orders; mathematical
programming; nonlinear; nonlinear problems; numerical
methods; parallel algorithms; parallel processing;
parallel solution; problems; recurrence problems;
recurrences involving matrix or binary quantities",
reviewer = "E. M. Reingold",
treatment = "A Application; P Practical",
}
@Article{Gruenberg:1974:SMC,
author = "E. L. Gruenberg and H. P. Raabe and C. T. Tsitsera",
title = "Self-Directional Microwave Communication System",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "149--163",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Description of a communication system in which sending
and receiving terminals automatically generate beams
focused upon each other, which arise solely from
ambient noise. The terminals are amplifying
retrodirective arrays of antenna elements. Analysis and
experiment are used to prove and verify the system
concept. Some engineering considerations pertinent to
system operation under various conditions are also
analyzed and discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5270D (Antenna arrays); B6250F (Mobile radio
systems)",
classification = "716",
corpsource = "IBM, Morris Plains, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "ambient noise; communication system; directive antenna
arrays; directive antennas; links; microwave; microwave
antenna arrays; microwave communication system; mobile
radio systems; noise; radio systems, mobile;
retrodirective arrays; self directional",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Kobayashi:1974:IDC,
author = "H. Kobayashi and L. R. Bahl",
title = "Image data compression by predictive coding. {I}.
Prediction algorithms",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "164--171",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Predictive coding techniques for efficient
transmission or storage of two-level (black and white)
digital images are dealt with.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6140 (Signal processing and
detection); C1260 (Information theory); C7410F
(Communications computing)",
classification = "723; 731",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adaptive linear predictor; adaptive predictor with
finite; algorithms; codes, symbolic; communications
applications of computers; data compression; digital
signals; encoding; fixed predictor; image data
compression; information theory --- Filtering and
Prediction Theory; memory; prediction; predictive
coding; two level digital images; video signals",
treatment = "P Practical; X Experimental",
}
@Article{Bahl:1974:IDC,
author = "L. R. Bahl and H. Kobayashi",
title = "Image data compression by predictive coding. {II}.
Encoding algorithms",
journal = j-IBM-JRD,
volume = "18",
number = "2",
pages = "172--179",
month = mar,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Predictive coding techniques for efficient
transmission or storage of two-level (black and white)
digital images are examined. Algorithms for prediction
are discussed as well as coding techniques for encoding
the prediction error pattern. First, the authors survey
some schemes for encoding if the error pattern is
assumed to be memoryless. Then a method is developed
for encoding certain run-length distributions. Finally,
some experimental results for sample documents are
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6140 (Signal processing and
detection); C1260 (Information theory); C7410F
(Communications computing)",
classification = "723; 731",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; applications of computers; codes,
symbolic; communication; communications applications of
computers; data compression; digital signals; encoding;
image data compression; information theory ---
Filtering and Prediction Theory; predictive coding; two
level digital images; video signals",
treatment = "P Practical; X Experimental",
}
@Article{Chow:1974:OSH,
author = "C. K. Chow",
title = "On Optimization of Storage Hierarchies",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "194--203",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90C50 (68A50 90B05)",
MRnumber = "52 \#12803",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A simple model of the storage hierarchies is
formulated with the assumptions that the effect of the
storage management strategy is characterized by the hit
ratio function. The hit ratio function and the device
technology-cost function are assumed to be
representable by power functions (or piece-wise power
functions). The optimization of this model is a
geometric programming problem. An explicit formula for
the minimum hierarchy access time is derived; the
technology of each storage level are determined. The
optimal number of storage levels in a hierarchy is
shown to be directly proportional to the logarithm of
the systems capacity with the constant of
proportionality dependent upon the technology and hit
ratio characteristics. The optimal cost ratio of
adjacent storage levels is constant, as are the ratios
of the device access times and storage capacities of
the adjacent levels. An illustration of the effect of
overhead cost and level-dependent cost, such as the
cost per ``box'' and cost of managing memory faults is
given and several generalizations are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cost function; data storage units; device access
times; device technology; economics; explicit formula;
function; geometric programming problem; hierarchy
access time; hit ratio; mathematical models; memory
hierarchy, Performance Evaluation: Analytic; minimum;
modelling; number of levels; optimal cost ratio;
optimisation; power functions; storage capacities;
storage hierarchies; storage levels; storage
management; storage management strategy; systems
capacity",
treatment = "E Economic; T Theoretical or Mathematical",
}
@Article{Karnaugh:1974:LPT,
author = "M. Karnaugh",
title = "Loss of Point-To-Point Traffic in Three-Stage Circuit
Switches",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "204--216",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A theoretical study is made of simple analytical
models for the point-to-point loss of telecommunication
traffic caused by blocking in three-stage circuit
switches. Two new models are compared with Jacobaeus'
frequently used model and with some simulation results
to determine regions of acceptable accuracy. The
effects of random hunting and sequential hunting for
routes are compared by simulation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6150 (Communication system theory); B6230 (Switching
centres and equipment)",
classification = "713; 718",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytical models; blocking by switching; division
link systems; electronic circuits, switching; hunting;
Jacobaeus model; loss models; matrix switches; point to
point traffic; random; route; sequential hunting;
simulation results; space; switching systems;
telecommunication traffic; telephone switching
equipment; theoretical study; three stage circuit
switching; three stage switches; time division link
systems; traffic",
treatment = "T Theoretical or Mathematical",
}
@Article{Lukes:1974:EAP,
author = "J. A. Lukes",
title = "Efficient Algorithm for the Partitioning of Trees",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "217--224",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05 (05C05)",
MRnumber = "49 \#10176",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an algorithm for partitioning a
graph that is in the form of a tree. The algorithm has
a growth in computation time and storage requirements
that is directly proportional to the number of nodes in
the tree. Several applications of the algorithm are
briefly described. In particular it is shown that the
tree partitioning problem frequently arises in the
allocation of computer information to blocks of
storage. Also, a heuristic method of partitioning a
general graph based on this algorithm is suggested.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "921",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "allocation of computer; applications; computation
time; efficient algorithm; general graph partitioning;
heuristic method; information; mathematical
programming, dynamic; partitioning of trees;
requirements; storage; storage allocation; trees
(mathematics)",
reviewer = "A. K. Dewdney",
treatment = "T Theoretical or Mathematical",
}
@Article{Rottmann:1974:PIC,
author = "H. R. Rottmann",
title = "Photolithography in Integrated Circuit Mask
Metrology",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "225--231",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Photoresist technology is shown to have important
advantages over the use of high resolution silver
halide films in dimensional metrology for integrated
circuit masks. Experimental techniques are shown for
the use of photoresist and chrome images in the study
of image quality and uniformity and in analysis of the
causes of image degradation. This method is applied to
in situ lens evaluation and to the measurement of the
precision of photorepeater stepping tables used in mask
fabrication. In addition, the value of 0.3 $\mu$ m is
established as the practical limit of dimensional
tolerance in the present photolithographic technology,
and its significance to the advancement of the state of
the art in mask manufacture is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4285 (Optical testing and workshop techniques); B2220
(Integrated circuits); B2570 (Semiconductor integrated
circuits)",
classification = "713; 742",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "causes of image; degradation; dimensional metrology;
dimensional tolerance; experimental; image quality;
image uniformity; integrated circuit mask metrology;
integrated circuit production; integrated circuits;
lens evaluation; lenses; measurement; mechanical
variables; optical images; photography;
photolithography; photolithography:; photoresist
technology; precision of photorepeater; silver halide
films; stepping tables: mask fabrication; techniques:
chrome images",
treatment = "X Experimental",
}
@Article{Lanza:1974:AAG,
author = "C. Lanza",
title = "Analysis of an {AC} Gas Display Panel",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "232--243",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The details and results for a one-dimensional
numerical analysis of the gaseous discharge occurring
at a single intersection of an AC gas panel are
reported. A particular object of the program is the
determination of the electric field magnitude as a
function of both position and time, taking into account
the field distortion due to the space charge. The
calculations are based on the Townsend avalanche
mechanism but omit the dynamic role of metastable neon
atoms in a Penning gas mixture. The calculated
electrical properties of the panel are compared with
experimental values.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2380 (Gas discharge tubes and devices)",
classification = "701; 804; 942",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas display; analysis; avalanche mechanism;
calculated; display systems; electric discharges;
electric field determination; electrical properties;
experimental results; field distortion; gas-discharge
tubes; gaseous discharge; gases, inert; instruments;
intersection; modelling; numerical analysis; one
dimensional analysis; panel; Penning gas mixture;
single; space charge; Townsend",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Lay:1974:SCO,
author = "F. M. Lay and C. K. Chu and P. H. Haberland",
title = "Simulation of Cyclic Operation of a Gas Panel Device",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "244--249",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a numerical simulation model for
the operation of a gas panel discharge cell with a
neon-argon mixture. The model is based on a Townsend
avalanche or direct ionization mechanism and secondary
emission, as well as Penning collisions or indirect
ionization. Charges on the dielectric walls are
included, but space-charge field distortion is
neglected. Cyclic operation of the cell is studied in
detail and the effects of geometric and electrical
parameters (e.g., gap and pulse widths) on the
operating characteristics of the cell (e.g., write,
sustain and erase voltages) have been obtained. The
results are in good agreement with experimental data
where available.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2380 (Gas discharge tubes and devices)",
classification = "804; 921; 942",
corpsource = "IBM, Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "characteristics; charges; collisions; cyclic
operation; dielectric wall; direct; display systems;
electrical parameters; erase voltage; gas panel device;
gas panel discharge cell; gas-discharge tubes; gases,
inert; geometric parameters: sustain voltage;
instruments; ionization mechanism; mathematical models;
modelling; Ne-Ar mixture: Townsend avalanche mechanism;
numerical simulation model; operating; Penning;
secondary emission; simulation; voltage; write",
treatment = "T Theoretical or Mathematical",
}
@Article{Birman:1974:PCM,
author = "A. Birman",
title = "On Proving Correctness of Microprograms",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "250--266",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "49 \#8412",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the results of an investigation
in proving the correctness of microprograms. The
vehicle used is the S-machine, which is a very simple
``paper'' computer. The approach to the proof of
correctness is based on formally defining the
machine-instruction level and the microprogramming
level of the given machine, and then showing that these
``interfaces'' are equivalent through the use of a
concept called algebraic simulation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C5220 (Computer
architecture)",
classification = "722; 723",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algebraic simulation; computer operating systems; data
storage units; interface equivalence; level;
microprogramming; microprogramming level;
microprograms; paper computer: machine instruction;
proving correctness; s-machine; S-machine; simulation",
reviewer = "W. D. Maurer",
treatment = "T Theoretical or Mathematical",
}
@Article{Godard:1974:CEU,
author = "D. Godard",
title = "Channel Equalization Using a {Kalman} Filter for Fast
Data Transmission",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "267--273",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is shown how a Kalman filter may be applied to the
problem of setting the tap gains of transversal
equalizers to minimize mean-square distortion. In the
presence of noise and without prior knowledge about the
channel, the filter algorithm leads to faster
convergence than other methods, its speed of
convergence depending only on the number of taps.
Theoretical results are given and computer simulation
is used to corroborate the theory and to compare the
algorithm with the classical steepest descent method.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1270 (Filters and other networks); B1290 (Other
analogue circuits); B6140 (Signal processing and
detection); C1260 (Information theory)",
classification = "722; 723; 731",
corpsource = "IBM, Alpes Maritimes, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; channel equalisation; classical steepest
descent method; computer simulation; computers --- Data
Communication Systems; control systems; data
transmission equipment; distortion minimisation;
equalisers; fast convergence; fast data transmission;
filter algorithm; Kalman filter; Kalman filters; mean
square; noise; tap gain setting; theoretical results;
transversal equalisers",
treatment = "T Theoretical or Mathematical",
xxtitle = "Channel equalisation using a {Kalman} filter for fast
data transmission",
}
@Article{Tang:1974:SAG,
author = "T. Tang",
title = "Stress Analysis of Glass-Bonded Ferrite Recording
Heads",
journal = j-IBM-JRD,
volume = "18",
number = "3",
pages = "274--278",
month = may,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Glass-bonded ferrite recording heads are subject to
appreciable thermal stress because of the difference in
thermal expansion between glass and ferrite in the
temperature range of the glassing cycle. A theoretical
analysis reveals the complexity of stress distributions
in the structure and pinpoints the critically stressed
areas in which a potential fracture or a magnetic
degradation of the material may occur. It is found that
the stresses are sensitive not only to the thermal
mismatch of the component materials but also to the
structural configuration. Low stress levels can be
achieved by matching expansions of the materials and by
proper head design, particularly in the optimization of
fillet angle and fillet height.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120 (Magnetic material
applications and devices); B6450 (Audio equipment and
systems)",
classification = "721",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic; design engineering;
distributions: critically stressed areas; expansion;
ferrite devices; fillet angle: fillet height; glass;
glass bonded ferrite; glassing cycle: theoretical
analysis: stress; instruments --- Recording; low stress
level design; magnetic heads; optimisation; recording
heads; stress analysis; stresses --- Thermal;
structural configuration; thermal; thermal mismatch;
thermal stress",
treatment = "T Theoretical or Mathematical",
}
@Article{Low:1974:OPU,
author = "D. W. Low",
title = "Optimal Pricing for an Unbounded Queue",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "290--302",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25",
MRnumber = "56 \#3970",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The maximization of expected reward is considered for
an M$_p$/M/s queueing system with unlimited queue
capacity. The system is controlled by dynamically
changing the price charged for the facility's service
in order to discourage or encourage the arrival of
customers. For the finite queue capacity problem, it
has been shown that all optimal policies possess a
certain monotonicity property, namely, that the optimal
price to advertise is a non-decreasing function of the
number of customers in the system. The main result
presented here is that for the unlimited capacity
problem, there exist optimal stationary policies at
least one of which is monotone. Also, an algorithm is
presented, with numerical results, which will produce
an epsilon -optimal policy for any epsilon less than 0,
and an optimal policy if a simple condition is
satisfied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C1330 (Optimal control)",
classification = "922",
corpsource = "IBM, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; economics; epsilon optimal policy; expected
reward; maximization of; monotonicity; optimal control;
optimal pricing; optimal stationary policies;
probability; queueing theory; unlimited queue
capacity",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{King:1974:ESP,
author = "W. F. {King III} and S. E. Smith and I. Wladawsky",
title = "Effects of Serial Programs in Multiprocessing
Systems",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "303--309",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model of a multiprocessing, multiprogramming
computer system with serially reusable programs was
developed to study the effect of serial programs on
system performance. Two strategies for implementing
serially reusable programs were investigated, a wait
strategy in which the processor waits until the serial
program is available, and a switch strategy, in which
the processor is freed to do other work. Relative
performances and asymptotic conditions as functions of
the number of processors, processes, serially reusable
programs, and the fraction of time each process
executes serially reusable programs were obtained.
Quantitative results are presented showing that the
switch strategy is superior. The wait strategy causes
quick saturation when the number of processes is
increased.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6150J
(Operating systems)",
classification = "723",
corpsource = "IBM, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; multiprocessing systems;
multiprogramming; multiprogramming computer system;
programming; serially reusable programs; strategy;
switch; system performance; theory; wait strategy",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{Kaneko:1974:OTS,
author = "T. Kaneko",
title = "Optimal Task Switching Policy for a Multilevel Storage
System",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "310--315",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Capacity demands for computer memory are increasing. A
multilevel storage system provides an economically
feasible solution without seriously affecting the total
response time. An M-level storage system is considered
in this paper. The capability of a digital computer
with a multilevel storage system is best enhanced in a
multiprogramming environment. In a high level storage
system, determination of a best task switching policy
becomes an important consideration. In this paper, a
queueing network is introduced to describe distribution
and flow of tasks in the system. An optimal switching
policy is determined in relation to the system's
overhead time. It is shown that in heavily CPU-limited
cases, the determination becomes a very simple one;
namely, the best policy is given as the threshold level
at which the accumulation of the average access time
exceeds the overhead time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1330 (Optimal control); C4290 (Other computer
theory); C5310 (Storage system design); C6150J
(Operating systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "average access time; best; computation theory;
computer memory; computer operating systems; design of
computer storage systems; digital storage; hierarchical
systems; high level storage system; multilevel storage;
multiprogramming; optimal systems; overhead time;
queueing network; queueing theory; system; task
switching policy",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{Gecsei:1974:DHR,
author = "J. Gecsei",
title = "Determining Hit Ratios for Multilevel Hierarchies",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "316--327",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "49 \#6705",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The applicability of stack processing for evaluation
of storage hierarchies has been limited to two-level
systems and to a very special group of multilevel
hierarchies. A generalization of stack processing,
called joint stack processing, is introduced. This
technique makes possible the efficient determination of
hit ratios for a class of multilevel hierarchies ---
staging hierarchies. These hierarchies are rather
realistic in the sense that they allow for multiple
block sizes and multiple copies of data in the
hierarchy. Properties of storage management schemes
that lend themselves to joint stack processing are
studied, and the notion of distributed hierarchy
management is described and illustrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310 (EDP management); C5310 (Storage system design);
C6120 (File organisation)",
classification = "723",
corpsource = "IBM Canada, Marie, Montreal, Que., Canada",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer selection and
evaluation; copies of data; digital storage;
distributed; efficient determination of hit; evaluation
of storage hierarchies; hierarchical systems; hierarchy
management; joint stack processing; memory hierarchy,
Performance Evaluation: Analytic; multilevel
hierarchies; multiple; multiple block sizes; ratios;
staging hierarchies; storage management; storage
management schemes",
reviewer = "A. L. Rosenberg",
treatment = "A Application",
xxnote = "Check month: June or July??",
}
@Article{Hanan:1974:ITL,
author = "M. Hanan and A. Mennone and P. K. {Wolff, Sr.}",
title = "Iterative-Interactive Technique for Logic
Partitioning",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "328--337",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method is developed for partitioning a computer
logic design into subsets by combining a constructive
method, used for the initial partition, with iterative
improvement techniques. These iterative techniques are
implemented in an interactive computing environment,
which further enhances their efficiency and usefulness.
An overview of the system is presented, several
algorithms discussed and experimental results given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210B (Computer-aided logic design)",
classification = "721; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computer-aided logic design; constructive
method; efficiency; improvement techniques; interactive
computing; interactive terminals; iterative; iterative
methods; logic design; logic partitioning; subsets;
usefulness",
treatment = "P Practical",
xxnote = "Check month: June or July??",
}
@Article{Choquet:1974:MMT,
author = "M. F. Choquet and H. J. Nussbaumer",
title = "Microcoded Modem Transmitters",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "338--351",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes various microcoded designs for
modem transmitters. The digital echo modulation
technique, originally introduced by J-M. Pierret, is
applied to cover the case of a fully digital universal
modem. The capabilities of several microcoded modem
designs are presented and their limitations are
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1250 (Modulators, demodulators, discriminators and
mixers); B6120B (Codes); B6120 (Modulation methods);
C5600 (Data communication equipment and techniques)",
classification = "716; 718",
corpsource = "IBM France, Alpes Maritimes, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "digital communication systems; digital echo
modulation; digital universal modem; microcoded;
microcoded modem transmitter; modem designs; modem
transmitters; modems; modulation; pulse-code;
transmitters",
treatment = "A Application",
xxnote = "Check month: June or July??",
}
@Article{Kyser:1974:QEM,
author = "D. F. Kyser and K. Murata",
title = "Quantitative Electron Microprobe Analysis of Thin
Films on Substrates",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "352--363",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Monte Carlo simulation procedure is developed for
kilovolt electron beam scattering and energy loss in
targets consisting of thin films on thick substrates.
Such calculations have direct application to the
nondestructive quantitative chemical analysis of
ultrathin films in the electron trajectory simulation
with the screened Rutherford expression for
cross-section, and energy loss between elastic
scattering events is calculated with the
continuous-slowing-down approximation of Bethe. The
contribution to x-ray fluorescence from the film due to
backscattered electrons from the substrate is accounted
for.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0250 (Probability theory, stochastic processes, and
statistics); A6114 (Electron determination of
structures); A6180F (Electron and positron effects);
A6180M (Channelling, blocking and energy loss of
particles); A6855 (Thin film growth, structure, and
epitaxy); A6860 (Physical properties of thin films,
nonelectronic); A8280 (Chemical analysis and related
physical methods of analysis)",
classification = "714; 801",
corpsource = "IBM, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alloy films; electron; electron microprobe analysis;
electron probe analysis; electron scattering; energy
loss; energy loss of; films; fluorescence; intensity
ratios; kilovolt electron beam scattering; Monte Carlo
methods; monte carlo simulation; particles; procedure;
thin films; thin films on thick substrates; trajectory
simulation; X-ray; X-ray fluorescence",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{Lee:1974:DFL,
author = "H. C. Lee",
title = "Drop Formation in a Liquid Jet",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "364--369",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A one-dimensional analysis of drop formation in a
liquid jet is developed under the assumption that the
axial velocity of the axisymmetric, nonviscous liquid
jet remains independent of the radial coordinate. The
resulting equations are used for both linear and
nonlinear analyses. In the linear form, this model
provides a stream stability relation comparable to that
of Rayleigh: transient solutions are obtained for given
initial conditions of an infinite stream. For the
nonlinear equations, numerical simulation was done to
study the satellite drop formation; with the present
model, the satellite drop is always formed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); A4755K (Multiphase
flows)",
classification = "631",
corpsource = "IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "drops; flow of fluids; jets; nonviscous liquid jet;
satellite drop formation; solutions; stream stability
relation; transient",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{Chang:1974:BQM,
author = "W. Chang",
title = "Bulk Queue Model for Computer System Analysis",
journal = j-IBM-JRD,
volume = "18",
number = "4",
pages = "370--372",
month = jun,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30",
MRnumber = "49 \#6418",
bibdate = "Sat Feb 24 09:26:14 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See comment \cite{Stacy:1975:CBQ}.",
abstract = "A bulk queue model was developed for analyzing a
multiprogrammed computer system. It can be used in
conjunction with closed queueing models to study
message queueing in a teleprocessing system. The model
is based on an imbedded Markov chain analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6150J
(Operating systems)",
classification = "723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; bulk queue model; computer metatheory;
computer system; computer system analysis; computer
systems programming --- Multiprogramming; imbedded
Markov chain analysis; modelling; multiprogrammed;
multiprogramming; queueing theory; systems",
reviewer = "J. G. C. Templeton",
treatment = "T Theoretical or Mathematical",
xxnote = "Check month: June or July??",
}
@Article{Ho:1974:IPD,
author = "P. S. Ho and R. Benedek",
title = "Interatomic Potentials and Defect Energetics in Dilute
Alloys",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "386--394",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is divided into two parts. The first
describes the construction of the interatomic potential
within the framework of pseudopotential theory. Based
on a local model potential, size and valence factors
are defined and their effect on the pair potentials
discussed. The second part deals with the calculation
of the impurity-vacancy binding energy and the
difference in diffusion activation energies for an
impurity and a host atom. Here, considerable effort has
been spent in the calculation of lattice relaxation
energies. For this purpose the Green's function
formulation of lattice statics has been used. The
results, particularly for migration energies, show that
lattice relaxation has a large effect.
Nontransition-metal impurities in aluminum were chosen
as the subject of numerical calculations. This choice
was motivated by the validity of the pseudopotential
approach for aluminum and also the existence of some
recent data for impurity diffusion and vacancy-solute
binding energies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170R (Crystal impurities: general); A6630J
(Diffusion, migration, and displacement of impurities
in solids)",
classification = "531",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aluminium; binding energy; boundaries; dielectric
screening; diffusion; diffusion in solids; dilute
alloys; Green's function; impurities; impurity vacancy;
interatomic potentials; lattice relaxation; metals and
alloys; nontransition metal; pseudopotential; theory;
vacancies (crystal)",
treatment = "T Theoretical or Mathematical",
}
@Article{Bogy:1974:SSC,
author = "D. B. Bogy and H. J. Greenberg and F. E. Talke",
title = "Steady Solution for Circumferentially Moving Loads on
Cylindrical Shells",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "395--400",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "295.73071",
abstract = "The steady, forced-wave solution is obtained for loads
that travel with constant speed on a simply supported
circular shell, the motion of which is damped
externally by air. Critical speeds are identified above
which the waveform, which is a standing wave in moving
coordinates, exhibits shorter wavelengths in front of
the load than behind it. At supercritical speeds the
solution becomes unbounded, because of loss of
stability, in the limit of no damping.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0320 (Classical mechanics of discrete systems:
general mathematical aspects); A0340D (Mathematical
theory of elasticity); A4610 (Mechanics of discrete
systems); A4630M (Vibrations, aeroelasticity,
hydroelasticity, mechanical waves, and shocks)",
classification = "408; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; constant; critical speed; cylindrical
shells; damping; domes and shells; effects; mechanical
oscillations; membrane; resonant conditions; rotating
bodies; speed; stability; standing wave; steady forced
wave solution; waveform; wavelengths",
treatment = "T Theoretical or Mathematical",
}
@Article{Donath:1974:EMR,
author = "W. E. Donath",
title = "Equivalence of memory to {``random logic''}",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "401--407",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "57 \#15753",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model of the design process for computer logic is
used to estimate the number of bits of memory required
to replace a so-called ``random-logic'' circuit. The
model can also be used to compare the respective time
delays of array logic and random logic.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210 (Logic design methods); C5320G (Semiconductor
storage)",
classification = "721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array logic; design; equivalence; equivalence ratio;
expansion process; logic design; memory; process;
random logic; semiconductor storage systems; time
delays",
treatment = "A Application; P Practical",
}
@Article{Ghosh:1974:SPS,
author = "S. P. Ghosh and M. E. Senko",
title = "String Path Search Procedures for Data Base Systems",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "408--422",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "51 \#9590",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper structures algorithms for the translation
of set theoretic queries into procedures for the search
of arbitrary complex networks constructed on a data
base using three basic types of strings. A method for
parametrization of queries which is appropriate for
accessing string structures is outlined and it is shown
how the properties of string structures can be used to
construct an algorithm for finding a search path with
minimum path cardinality for a given query addressed to
such a network. (The term data management system is
used instead of data base management system).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C7100 (Business and
administration)",
classification = "723; 901",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; base systems; core type storage media;
data; data management system; data processing --- Data
Handling; data structures; file organisation;
information science; management information; minimum
path cardinality; query language; search path; software
system; string selection criterion; string structures;
systems",
reviewer = "I. Kaufmann",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Gaver:1974:AED,
author = "D. P. Gaver and P. A. W. Lewis and G. S. Shedler",
title = "Analysis of Exception Data in a Staging Hierarchy",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "423--435",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "305.68053",
abstract = "This paper is an analysis of program address trace
data in a demand-paged computer system with a
three-level staging hierarchy. The primary objective is
to explore the data both graphicaly and numerically,
using methods that may be useful when other data traces
become available. In addition, plausible point-process
type models are fit to the data. Such an approach,
combining data-analytic procedures with probability
modeling, should prove useful in understanding program
behavior and thus will aid in the rational design of
complex computer systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150G (Diagnostic,
testing, debugging and evaluating systems); C6150J
(Operating systems)",
classification = "723",
corpsource = "Naval Postgraduate School, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer metatheory --- Programming Theory; computer
systems programming; computer testing; data traces;
demand paged computer system; exception data; graphical
method; memory hierarchy, Performance Evaluation:
Experimental; multiprogramming; point process;
probability modelling; program address trace data;
program tapes; statistical data analysis; three level
staging hierarchy; virtual storage",
treatment = "A Application; P Practical",
}
@Article{Chang:1974:SDF,
author = "W. H. Chang and L. G. Heller",
title = "Structure Dependence of Free-Charge Transfer in
Charge-Coupled Devices",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "436--442",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A detailed numerical analysis of charge-coupled-device
(CCD) charge transfer is described and discussed. The
analysis is based on solving the transport equation
with a time-dependent surface field calculated from the
actual device configuration. Devices with different
oxide thicknesses and devices with electrode gaps are
examined. The total field is found to play an important
role in charge transfer for all cases studied. The
effective channel length is modulated by the net field
present and is a function of time and electrode
configuration. The transfer is found fastest and the
effective channel length shortest when the charge is
transferred from a region of low oxide capacitance into
a region of high oxide capacitance. A low-capacitance
electrode gap slows the charge transfer process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
classification = "714",
corpsource = "IBM, Burlington, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CCD; characteristic; charge coupled devices; charge
exchange; charge-coupled devices; effective channel
length; electrode configuration; electrode gaps;
numerical analysis; oxide capacitance; oxide
thicknesses; potential wells; semiconductor devices,
mis; time dependent surface field; transfer; transport
equation",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Hong:1974:MHA,
author = "S. J. Hong and R. G. Cain and D. L. Ostapko",
title = "{MINI}: a heuristic approach for logic
minimization",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "443--458",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "54 \#12384",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A general two-level logic function minimization
technique, MINI, is described. The MINI process does
not generate all prime implicants nor perform the
covering step required in a classical two-level
minimization. Rather, the process uses a heuristic
approach that obtains a near minimal solution in a
manner which is efficient in both computing time and
storage space. MINI is based on the positional cube
notation in which groups of inputs and the outputs form
separate coordinates. Regular Boolean minimization
problems are handled as a particular case. The
capability of handling multiple output functions is
implicit.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230 (Switching theory)",
classification = "723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approach; Boolean functions; Boolean logic; computer
metatheory; conventional logic; expanding; heuristic;
input output table; Karnaugh map; MINI; minimal
implicant solution; minimisation of switching nets;
minterm; multivalued variables; prime implicants;
removing redundancy from cubes; reshaping;
subprocesses",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Ostapko:1974:GTE,
author = "D. L. Ostapko and S. J. Hong",
title = "Generating Test Examples for Heuristic {Boolean}
Minimization",
journal = j-IBM-JRD,
volume = "18",
number = "5",
pages = "459--464",
month = sep,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "55 \#14432",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This article describes simple methods of generating
many-variable test-case problems for heuristic logic
minimization studies. Covering problems and coloring
problems are converted into Boolean functions that are
useful test cases for minimization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230 (Switching theory)",
classification = "723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Boolean; Boolean functions; cases; colouring problems;
computer metatheory; covering problems; degree of
minimality; don't care; heuristic logic; many variable
test cases; minimisation of switching nets;
minimization; minterm; symmetric function; test",
reviewer = "H. R. Hwa",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Lennemann:1974:AAD,
author = "E. Lennemann",
title = "Aerodynamic Aspects of Disk Files",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "480--488",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Airflows between centrally clamped, rotating, rigid
disks are investigated with respect to the type of flow
pattern, the parameters that influence nonuniform flow,
and the effects of various flow patterns on disk
stability. The experimental method uses a water-flow
modeling technique for the airflow. The observed flow
patterns are highly unsteady. The configuration and
position of the shroud and slider arm are found to be
the major parameters that influence flow
characteristics. A reduction of disk flutter by a
factor of 12 can be achieved when the unsteady flow
pattern is changed to a steady flow pattern.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM, Deutschland GmbH., Boeblingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerodynamics; airflows; data storage, magnetic; disc
stability; flow pattern; flutter; magnetic disc and
drum storage; magnetic disc files; modelling;
random-access storage; rotating bodies; shroud; slider
arm; stability; water flow",
treatment = "X Experimental",
}
@Article{Mulvany:1974:EDD,
author = "R. B. Mulvany",
title = "Engineering Design of a Disk Storage Facility with
Data Modules",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "489--505",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design of the IBM 3340 Direct Access Storage
Facility with IBM 3348 Data Modules incorporates new
concepts and required the development of several
innovative components, including newly designed
magnetic read-write heads. The heads start and stop in
contact with the disk and use a tri-rail, air-bearing
slider having a low mass. Each data module includes
read-write heads, a head carriage, disks, and a disk
spindle. The rationale is discussed for the design
concepts and for several components, including the data
module, head and arm assembly, and the moving-coil
linear actuator. A method of improving data integrity,
utilizing a ``disk-defect skipping'' procedure, is
described and its performance implications discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3260B (Electric actuators and final control
equipment); C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "concepts; data integrity; data modules; data storage,
magnetic; design; design engineering; disc defect
skipping; drum storage; electric actuators; head and
arm assembly; head carriage; magnetic disc and;
magnetic disc storage facility; magnetic heads;
magnetic read/write heads; moving coil linear actuator;
security of data; storage; three rail air bearing
slider; units",
treatment = "P Practical",
}
@Article{Oswald:1974:DDF,
author = "R. K. Oswald",
title = "Design of a Disk File Head-Positioning Servo",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "506--512",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The engineering design of a head-positioning system
for an interchangeable-medium disk file is considered.
Emphasis is placed upon three specific functions within
the positioning system: encoding and demodulation of
information from the dedicated servo surface,
compensation and dynamics of the track-following
control system, and implementation of control
electronics for a quasi-time-optimal, track-assessing
control system. The examples used are taken from the
IBM 3340 Disk Storage Facility.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3120C (Spatial variables control); C3200 (Control
equipment and instrumentation); C5320 (Digital
storage)",
classification = "721; 722",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compensation; control electronics; data storage,
magnetic; demodulation; design engineering; disc and
drum storage; encoding; engineering design; error
compensation; head positioning servo; interchangeable
medium disc file; magnetic; magnetic heads; position
control; servomechanisms; track accessing; track
following",
treatment = "A Application; P Practical",
}
@Article{Stahl:1974:DRS,
author = "K. J. Stahl and J. W. White and K. L. Deckert",
title = "Dynamic Response of Self-Acting Foil Bearings",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "513--520",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new approach to the analysis of wide foil bearings
is investigated. The equation of motion for a finite
length of tape is coupled to the transient lubrication
equation for the air film between the tape and the
recording head. Compressibility and slip flow are
retained in the fluid mechanics equation; flexural
rigidity and high-speed dynamic effects are retained in
the tape equation. The steady-state solution to the
coupled equations is obtained as the limiting case of
the transient initial value problem. Describing the
system equations relative to the undeflected tape (as
opposed to conventional foil-bearing theory, which uses
the head as the reference surface) permits
investigation of noncircular head geometries. In
addition, wave propagation effects in the tape and the
interaction of waves in the tape with the air-bearing
region may be studied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320 (Digital storage)",
classification = "601",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air film; bearings; compressibility; dynamic response;
equation of motion; finite length of tape; flexural
rigidity; foil bearings; machine bearings; magnetic
tape equipment; noncircular head geometries; recording
head; self acting foil bearings; slip flow; transient
initial value problem; transient lubrication equation;
wave propagation effects; wide",
}
@Article{Vogel:1974:WLI,
author = "S. M. Vogel and J. L. Groom",
title = "White Light Interferometry of Elastohydrodynamic
Lubrication of Foil Bearings",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "521--528",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an experiment performed to verify
the one-dimensional model of elastic foil behavior
developed by K. S. Stahl, J. W. White,K. L. Decker. In
the experiment, a loop of tape one inch wide passes
over a stationary recording head and the air-film
thickness between the head and the foil is determined
using white light interferometry. Measured data for
various experimental conditions are compared with the
predictions of the model and also with prior
foil-bearing analyses. The influence of parameters such
as tape thickness, head radius, tape tension, etc., on
the nature of the spacing field is demonstrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0760L
(Optical interferometry); C5320 (Digital storage)",
classification = "601",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bearings; elastohydrodynamic lubrication of foil
bearings; head radius; light interferometry;
lubrication; machine bearings; magnetic tape equipment;
model; recording head; spacing field; stationary; tape;
tape tension; thickness; thickness measurement; white
light interferometry",
treatment = "X Experimental",
}
@Article{Fleischer:1974:ILI,
author = "J. M. Fleischer and C. Lin",
title = "Infrared Laser Interferometer for Measuring
Air-Bearing Separation",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "529--533",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design and characteristics are presented for an
infrared instrument capable of measuring air-bearing
separation distances over a mechanical bandwidth
ranging from DC to 30 kHz. The measurement technique
involves monitoring optical intensity variations of the
interferometric cavity formed by two air-bearing
surfaces. This intensity varies between a minimum at
zero separation and a maximum at a distance equal to
one-quarter of the optical wavelength. For air-bearing
distances less than 1 $\mu$ m, a convenient source is
the 3.391 $\mu$ m infrared line of the helium-neon
laser. By continually monitoring a fraction of the
intensity of the optical source, a real-time analog
division can be performed on the spacing signals to
produce an output independent of laser intensity
variations. Room-temperature indium arsenide detectors
were selected for their high responsivity and rapid
rise time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0760L
(Optical interferometry); B7320C (Spatial variables
measurement); C5320 (Digital storage)",
classification = "601",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air bearing separation; air bearings; bearings;
characteristics; design; devices; distance measurement;
He-Ne laser; infrared laser interferometer;
interferometers; interferometric cavity; laser beam
applications; light; machine bearings; magnetic
storage; magnetic storage devices; measurement;
mechanical bandwidth; optical intensity variations;
spacing signals; thickness measurement",
treatment = "A Application",
}
@Article{Tseng:1974:TBL,
author = "R. C. Tseng and F. E. Talke",
title = "Transition from Boundary Lubrication to Hydrodynamic
Lubrication of Slider Bearings",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "534--540",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The transition from boundary lubrication to fully
hydrodynamic lubrication is investigated for
air-lubricated slider bearings using the electrical
resistance method. Intermittent contacts are shown to
exist even under conditions for which the numerical
solution of the Reynolds equation or white light
interferometry predicts steady state spacings in the
spacing region from 0.125 to 0.25 $\mu$ m. The
transition is similar to the one found in the presence
of liquid films, being influenced for a given surface
roughness of disk and slider by load, speed, and
hydrodynamic design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7310J (Impedance and admittance measurement); B7320Z
(Other nonelectric variables measurement); C5320
(Digital storage)",
classification = "601",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air lubricated slider bearings; bearings; boundary;
boundary layers; devices; electrical resistance method;
hydrodynamic design; hydrodynamic lubrication;
hydrodynamics; liquid films; load; lubrication;
machine; magnetic disc and drum storage; magnetic disc
file; magnetic storage; resistance measurement;
roughness; speed; steady state spacings; surface;
transition",
treatment = "X Experimental",
}
@Article{Bajorek:1974:HMT,
author = "C. H. Bajorek and C. Coker and L. T. Romankiw and D.
A. Thompson",
title = "Hand-Held Magnetoresistive Transducer",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "541--546",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The initial design of a vertical magnetoresistive head
in a hand-held wand for reading magnetically encoded
price tags and credit cards is discussed. The
performance of the head (e.g., resolution, signal shape
and amplitude, and signal-to-noise ratio) is
analytically and experimentally evaluated as a function
of the configuration of the sensor, head-to-medium
interface, and sensor processing and materials.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120N (Magnetic thin
film devices); C5320E (Storage on stationary magnetic
media); C5320 (Digital storage)",
classification = "714; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amplitude; data processing, business --- Data
Acquisition; handheld wand; magnetic devices, thin
film; magnetic heads; magnetic thin film devices;
magnetically encoded credit cards; magnetically encoded
price tags; magnetoresistance; magnetoresistive
transducers; resolution; S/N ratio; sensor processing;
signal; signal shape; transducers; vertical
magnetoresistive head",
treatment = "A Application",
}
@Article{Hempstead:1974:TIP,
author = "R. D. Hempstead",
title = "Thermally Induced Pulses in Magnetoresistive Heads",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "547--550",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The thermal response of a magnetoresistive head is
analyzed for frictional heating between the head
surface and dust particles or other asperities on the
recording medium surface during relative motion of the
head and medium. A theoretical model is presented
showing that pulses are induced in the output of a
magnetoresistive head as a result of this frictional
heating. The model predicts the dependence of these
thermal noise spikes on the thermal properties of the
substrate and cover chip for the magnetoresistive head,
the dimensions of the magnetoresistive stripe, the
head-medium relative velocity, and the rate of
frictional heat generation. Experimental verification
of the theoretical model is obtained by scanning a
focused laser beam across a head.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120N (Magnetic thin
film devices); C5320C (Storage on moving magnetic
media)",
classification = "714; 723",
corpsource = "IBM Thomas J. Watson, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "asperities; beam; data processing, business --- Data
Acquisition; devices; focused laser; friction;
frictional heating; heating; magnetic devices, thin
film; magnetic heads; magnetic thin film;
magnetoresistance; magnetoresistive head;
magnetoresistive stripe; modelling; relative velocity;
theoretical model; thermal noise; thermal noise
spikes:; thermal response; thin film transducer",
treatment = "T Theoretical or Mathematical",
}
@Article{Cole:1974:NAS,
author = "R. W. Cole and R. I. Potter and C. C. Lin and K. L.
Deckert and E. P. Valstyn",
title = "Numerical Analysis of the Shielded Magnetoresistive
Head",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "551--555",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Numerical computations for the shielded
magnetoresistive head are reported and compared with
previous analytic and experimental results. Linear
resolution is found to be essentially the same as for
inductive heads. Output amplitude is in the range 50 to
175 V per meter track width for a sense current density
of 5 multiplied by 10**1**0 A/m**2.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120N (Magnetic thin
film devices); C5320C (Storage on moving magnetic
media)",
classification = "714; 723",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; current density; data processing, business
--- Data Acquisition; linear resolution; magnetic
devices, thin film; magnetic heads; magnetic shielding;
magnetic thin film devices; magnetoresistance;
numerical; numerical analysis; output amplitude; sense
current density; shielded magnetoresistive head",
treatment = "T Theoretical or Mathematical",
}
@Article{Comstock:1974:FFR,
author = "R. L. Comstock and E. B. Moore",
title = "Ferrite Film Recording Surfaces for Disk Recording",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "556--562",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Ferrite thin films have been prepared using a chemical
deposition process: hematite and substituted hematite
films were formed by spin coating a diluted solution of
the metal nitrates on a substrate and subsequently
heating the substrate in air to 300C to crystallize the
film. Magnetic ferrite films were formed by reducing
the films in a wet hydrogen atmosphere. Process
parameters, which have evolved from studies on spin
coating and reduction on 7.62- and 35.56-cm substrates,
have been determined that result in desirable magnetic
properties. Experimental studies of film composition
and morphology are reported. It has been determined
both theoretically and experimentally that film
thickness near 0.125 $\mu$ m is optimum for
high-density recording with heads with gap lengths of
approximately 1 $\mu$ m spaced about 0.5 $\mu$ m from
the film. A TiO$_2$ undercoat (0.125 $\mu$ m) on the
Al-Mg alloy substrate was prepared by chemical vapor
deposition and resulted in improved magnetic
properties. Magnetic properties of the films and
magnetic recording performance of disks using Ti and Al
substrates with the TiO$_2$ undercoat are reported.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120N (Magnetic thin
film devices); B3120 (Magnetic material applications
and devices); C5320C (Storage on moving magnetic
media)",
classification = "708; 721; 722",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al-Mg alloy substrate; coating techniques; data
storage, digital --- Ferrite Applications; data
storage, magnetic; drum storage; ferrite applications;
ferrite thin; ferrites --- Thin Films; film; film
composition; films; haematite films; magnetic disc and;
magnetic disc recording; magnetic recording; magnetic
thin films; morphology; performance; spin coating;
thickness; TiO/sub 2/ undercoat",
treatment = "A Application",
}
@Article{Bate:1974:RSR,
author = "G. Bate and L. P. Dunn",
title = "The remanent state of recorded tapes",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "563--569",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements are reported on the in-plane and the
perpendicular components of the remanence a tape
acquires on passing through the steady field of a
recording head. The tape coating were oriented and
unoriented particles of gamma -Fe$_2$O$_3$, oriented
CrO$_2$ and unoriented Co-substituted gamma
-Fe$_2$O$_3$. The two writing heads used had 10 $\mu$
m-and 2.25 $\mu$ m-gaps, respectively. In each case the
in-plane magnetization increases at first with
increasing writing current, and eventually reaches a
peak that less than the maximum in-plane remanence
produced on the same sample by an electromagnet. For
higher values of writing current, in-plane
magnetization in the tape actually decreases. The
perpendicular remanence is not large enough to explain
the difference between the in-plane remanence acquired
from the head and the remanence acquired in a magnet.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
classification = "722",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "coatings; data storage, magnetic; inplane
magnetisation; magnetic recording; magnetic tape;
magnetic tapes; magnetisation; perpendicular
magnetization; recorded tapes; recording performance;
remanence; tape; writing heads",
treatment = "X Experimental",
}
@Article{Su:1974:NDD,
author = "J. L. Su and M. L. Williams",
title = "Noise in Disk Data-Recording Media",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "570--575",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements were made of recording medium noise in
erased disks using an in-contact magnetoresistive
element and an inductive head supported on an air
bearing slider. Four types of coatings on aluminum
disks were examined: thin, transition-metal alloy film,
CrO$_2$, FeCo particle, and gamma -Fe$_2$O$_3$. Results
obtained by means of three measurement techniques are
in qualitative agreement and indicate that: DC-erased
noise of alloy film disks is 14 to 20 dB lower than
that of particulate disks measured; DC-erased noise of
particulate disks measured is 6 to 16 dB above their
bulk-erased noise; although DC noise of particulate
disks increases with write current, DC noise of alloy
film disks is independent of write current; the shapes
of the noise spectra are similar in DC-erased
particulate gamma -Fe$_2$O$_3$ disks and FeCo particle
coated disks; and significant modulation noise is
detected on particulate disks but not on alloy film
disks. The observed DC-erased noise spectrum is
compared with the model for small particle noise and is
then used to estimate the size of particle agglomerates
or voids.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7310L (Magnetic variables measurement); C5320C
(Storage on moving magnetic media)",
classification = "722",
corpsource = "IBM, Monterey, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "agglomerates; air bearing slider; Al discs; alloy film
discs; data storage, magnetic; DC erased; in contact
magnetoresistive element; inductive head; magnetic disc
and drum storage; magnetic recording; measurement;
modulation noise; noise; noise spectra; particle size;
particulate discs; recording medium; size of particle;
write current",
treatment = "X Experimental",
}
@Article{Thornley:1974:SSM,
author = "R. F. M. Thornley and J. A. Williams",
title = "Switching Speeds in Magnetic Tapes",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "576--578",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Comparative measurements are reported on the switching
speeds of three different magnetic tape materials, as
determined by application of short field pulses of
well-defined duration and magnitude. A sensitive
measure of the change in magnetization is the length of
applied pulse required for the peak readback signal to
drop from 60 percent to 40 percent of its peak value.
This pulse length was 2.6 ns for a gamma -Fe$_2$O$_3$
tape, 4.1 ns for a CrO$_2$ tape, and 1.4 ns for a
cobalt-substituted gamma -Fe$_2$O$_3$ tape.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7310L (Magnetic variables measurement); C5320C
(Storage on moving magnetic media)",
classification = "722",
corpsource = "IBM, Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "change in magnetization; data storage, magnetic ---
Tape; magnetic switching; magnetic tape; magnetic
tapes; peak readback signal; pulse length; short field
pulses",
treatment = "X Experimental",
}
@Article{Patel:1974:ORC,
author = "A. M. Patel and S. J. Hong",
title = "Optimal Rectangular Code for High Density Magnetic
Tapes",
journal = j-IBM-JRD,
volume = "18",
number = "6",
pages = "579--588",
month = nov,
year = "1974",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "IBM's 6250 bpi 3420 tape units require a powerful
error-correcting code for the standard 9-track format.
The optimal rectangular code (ORC), presented here, is
designed to correct any single-track error or, given
erasure pointers, any double-track error in the tape.
The code achieves this by conforming to a rectangular
codeword of which two orthogonal sides are check bits.
The code is specially tailored from a general class of
b-adjacent codes. The ORC can be implemented without a
buffer for encoding and offers a simple
error-correction mechanism. The code can be generalized
to multiple-channel applications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C6130 (Data
handling techniques)",
classification = "722",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic --- Tape; error correction
code; error correction codes; high density magnetic
tapes; magnetic tape; magnetic tapes; optimal;
rectangular code",
treatment = "P Practical",
}
@Article{Keppel:1975:ACS,
author = "E. Keppel",
title = "Approximating complex surfaces by triangulation of
contour lines",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "2--11",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05C99 (53C45 68A45)",
MRnumber = "53 \#210",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); B0290F (Interpolation
and function approximation); C1180 (Optimisation
techniques); C4130 (Interpolation and function
approximation)",
corpsource = "IBM, Heidelberg, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; combinatorial problem; complex surfaces;
contour lines; curve fitting; graph theory; human head;
optimal approximation; optimisation; radiation therapy
planning; triangulation",
reviewer = "A. K. Dewdney",
treatment = "T Theoretical or Mathematical",
}
@Article{Burge:1975:SPF,
author = "W. H. Burge",
title = "Stream Processing Functions",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "12--25",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "One principle of structured programming is that a
program should be separated into meaningful independent
subprograms, which are then combined so that the
relation of the parts to the whole can be clearly
established. This paper describes several alternative
ways to compose programs. The main method used is to
permit the programmer to denote by an expression the
sequence of values taken on by a variable. The sequence
is represented by a function called a stream, which is
a functional analog of a coroutine. The conventional
while and for loops of structured programming may be
composed by a technique of stream processing (analogous
to list processing), which results in more structured
programs than the originals. This technique makes it
possible to structure a program in a natural way into
its logically separate parts, which can then be
considered independently.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; coroutine; functional analogue;
independent subprograms; programming; stream processing
functions; structured programming",
treatment = "T Theoretical or Mathematical",
}
@Article{Lomet:1975:SIR,
author = "D. B. Lomet",
title = "Scheme for Invalidating References to Freed Storage",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "26--35",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A storage management scheme is described that supports
the invalidation of addresses to freed storage and
thus, in that sense, provides a secure system. Unlike
previous virtual memory techniques, the allocated areas
of the scheme can vary from the very large, requiring
multiple pages of storage, to the very small, in which
several can be contained on a single page. Special
treatment is accorded procedure activation storage so
as to provide increased effectiveness for this
important case. The interaction of this deletion scheme
with garbage collection techniques is also examined.
Finally, the relative advantages of retention and
deletion strategies of storage management are
considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "addresses; computer systems programming; deletion
scheme; freed storage reference invalidation; garbage
collection techniques; retention; scheme; secure
system; storage management; virtual memory techniques;
virtual storage",
treatment = "T Theoretical or Mathematical",
}
@Article{Chandy:1975:PAQ,
author = "K. M. Chandy and U. Herzog and L. Woo",
title = "Parametric Analysis of Queueing Networks",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "36--42",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20 (90B10)",
MRnumber = "52 \#2755",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A queueing network is considered with M exponential
service stations and with N customers. The behavior is
studied of a subsystem sigma, which has a single node
as input and a single node as output, when the
subsystem parameters are varied. An ``equivalent''
network is constructed in which all queues except those
in subsystem sigma are replaced by a single composite
queue. It is shown that for certain classes of system
parameters, the behavior of subsystem sigma in the
equivalent network is the same as in the given network.
The analogy to Norton's theorem in electrical circuit
theory is demonstrated. In addition, the equivalent
network analysis can be applied to open exponential
networks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B1130 (General circuit
analysis and synthesis methods); C1140C (Queueing
theory)",
classification = "713; 922",
corpsource = "Univ. Texas, Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analogies; customers; electrical circuit theory;
equivalent circuits; equivalent network analysis;
exponential service stations; network analysis; node;
Norton's theorem; open exponential networks; parametric
analysis; probability; queueing networks; queueing
theory; single; single composite queue; subsystem",
reviewer = "T. N. Bhargava",
treatment = "T Theoretical or Mathematical",
xxtitle = "Parametric analysis of queuing networks",
}
@Article{Chandy:1975:AAG,
author = "K. M. Chandy and U. Herzog and L. Woo",
title = "Approximate Analysis of General Queueing Networks",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "43--49",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20 (90B10)",
MRnumber = "52 \#2756",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An approximate iterative technique for the analysis of
complex queueing networks with general service times is
presented. The technique is based on an application of
Norton's theorem from electrical circuit theory to
queueing networks which obey local balance. The
technique determines approximations of the queue length
and waiting time distributions for each queue in the
network. Comparison of results obtained by the
approximate method with simulated and exact results
shows that the approximate method has reasonable
accuracy.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B0290F (Interpolation and
function approximation); B1130 (General circuit
analysis and synthesis methods); C1140C (Queueing
theory); C4130 (Interpolation and function
approximation)",
classification = "922",
corpsource = "Univ. Texas, Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approximate; approximate analysis; complex queueing
networks; electrical circuit theory; function
approximation; general; iterative methods; iterative
technique; local balance; network analysis; Norton's
theorem; probability; queue length; queueing theory;
service times; waiting time distributions",
reviewer = "T. N. Bhargava",
treatment = "T Theoretical or Mathematical",
xxtitle = "Approximate analysis of general queuing networks",
}
@Article{Rideout:1975:DDC,
author = "V. L. Rideout and F. H. Gaensslen and A. LeBlanc",
title = "Device Design Considerations for Ion Implanted
$n$-Channel {MOSFET}s",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "50--59",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Considerations are presented for ion implanted,
n-channel, polysilicon gate, enhancement-mode MOSFETs
for dynamic switching applications. A shallow channel
implant is used to raise the magnitude of the gate
threshold voltage while also maintaining a low
substrate sensitivity. Design trade-offs between
channel implantation energy and dose and substrate bias
were examined using both computer analyses and
experimental devices. The design objective was to
identify the combination of these three parameter
values that gives both a low substrate sensitivity and
a steep subthreshold conduction characteristic under
the conditions of a gate threshold voltage of 1 v and a
substrate bias range of 0 to minus 1 v. One-dimensional
and two-dimensional computer analyses were performed to
predict the effect of the device parameters on the
electrical characteristics. MOSFETs were then
fabricated to investigate the extremes of the design
parameter range, and the experimental and predicted
device characteristics were compared.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0510 (Crystal growth); B2550B (Semiconductor doping);
B2550 (Semiconductor device technology); B2560S (Other
field effect devices)",
classification = "713; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analyses; channel; computer; design considerations;
dose; dynamic; enhancement mode; field effect
transistors; implantation energy; integrated circuits,
digital; ion implantation; MOSFETs; n-channel;
polysilicon gate; shallow channel implant; steep
subthreshold conduction characteristic; substrate bias;
substrate sensitivity; switching applications;
transistors, field effect",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Yhap:1975:KMC,
author = "E. F. Yhap",
title = "Keyboard Method for Composing {Chinese} Characters",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "60--70",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A keyboard method is described that allows a user to
form Chinese characters. The user's keystrokes activate
internal logic, which performs the necessary scaling
and positioning of the character components. An initial
design using a 40-key keyboard is described, together
with approximations of the character shapes produced by
given keying sequences. Rough estimates of speed range
from eight to 33 characters per minute.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays)",
classification = "745",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "40 key keyboard; character sets; character shapes;
composing Chinese characters; internal; keyboards;
logic; typewriters",
treatment = "P Practical",
}
@Article{Wang:1975:SSL,
author = "C. P. Wang and H. H. Wedekind",
title = "Segment Synthesis in Logical Data Base Design",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "71--77",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A15 (68A30)",
MRnumber = "50 \#16115",
bibdate = "Sat Feb 24 09:26:54 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See comments
\cite{Bernstein:1976:CSS,Wiederhold:1976:COS}.",
abstract = "Identification and representation of entities and
their relationships relevant to an application are some
of the key problems in logical data base design. This
paper presents an approach to synthesizing logical
segments that are representations of such entities and
relationships. The major steps in this design are (1)
collect all the pertinent functional relations in the
application domain; (2) remove redundant relations to
obtain a minimal covering set; (3) minimize the number
of relations in the covering set to obtain an optimal
set of relations in the third normal form; and (4)
combine relations into logical segments according to
prescribed performance requirements and projected
information maintenance activities. Synthesis of
logical segments for an airline reservations
applications is used as an illustrative example.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C7100 (Business and
administration)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "activities; airline reservations application; data
processing; entities; file organisation;
identification; information maintenance; logical data
base design; management information systems; minimal
covering; optimal set of relations; relationships;
representation; segment synthesis; set",
reviewer = "W. W. Armstrong",
treatment = "P Practical",
}
@Article{Gay:1975:CPQ,
author = "T. W. Gay and P. H. Seaman",
title = "Composite Priority Queue",
journal = j-IBM-JRD,
volume = "19",
number = "1",
pages = "78--81",
month = jan,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "50 \#15477",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Formulas are given for calculating waiting time for
customers in a queue with combined preemptive and
head-of-line (nonpreemptive) priority scheduling
disciplines and describes the reasoning behind them.
This work has been applied in the development of
programmable terminal control units.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory)",
classification = "922",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "composite priority queue; control units; head of line;
priority scheduling disciplines; probability;
programmable terminal; queueing theory; waiting time",
reviewer = "Izhak Rubin",
treatment = "T Theoretical or Mathematical",
}
@Article{Fleisher:1975:IAL,
author = "H. Fleisher and L. I. Maissel",
title = "An introduction to array logic",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "98--109",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "After a discussion of the reasons for choosing to
implement logic in array form, a detailed description
of the nature of array logic is given. Topics
specifically discussed include general array structures
and implementation, influence of decoder partitioning,
design of logic arrays, output phase, ``split''
variables, feedback in logic arrays, and
reconfiguration.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5120 (Logic and switching circuits); C5210 (Logic
design methods)",
classification = "721; 723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array chips; array decoder; array logic; array
structures; bit; combinatorial logic; computer systems
programming --- Table Lookup; decoder partitioning;
feedback; implement logic; logic circuits; logic
design; output phase; reconfiguration; storing",
treatment = "T Theoretical or Mathematical",
}
@Article{Logue:1975:HIS,
author = "J. C. Logue and N. F. Brickman and F. Howley and J. W.
Jones and W. W. Wu",
title = "Hardware Implementation of a Small System in
Programmable Logic Arrays",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "110--119",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Programmable Logic Arrays, PLAs, exploit many of the
benefits of LSI but without the high engineering design
costs. This paper describes an experiment in the design
and implementation of a small complex system in array
logic. The IBM 7441 Buffered Terminal Control Unit was
selected for this comparison because it is a small but
complex terminal controller implemented in dual in-line
packaged transistor logic, DIP-TL, with small to medium
scale integration.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5120 (Logic and switching circuits); C5210 (Logic
design methods); C5220 (Computer architecture)",
classification = "721; 722; 723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array oriented; array oriented structure; arrays;
computer architecture; computer architecture ---
Microprogramming; digital circuits; language; large;
logic arrays; logic circuits; logic design; LSI; macro
capability; master chip; PLA; programmable logic; scale
integration; transistor logic",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Jones:1975:ALM,
author = "J. W. Jones",
title = "Array Logic Macros",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "120--126",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A macro design approach is discussed which combines
the cost-effective attributes of array logic structures
with those of random logic. These macros utilize the
following features: (a) internal feedback registers for
performing sequential logic, (b) masking and submasking
to reduce the number of words in the array for certain
functions, (c) control of the array's output level to
vary the apparent size of the array, (d) decoding on
input pairs and\slash or EXCLUSIVE ORing on output
pairs for increasing the number of logic levels, and
(e) random-access memory in the feedback and its use in
interrupt handling. The macros are explained by
specific design examples. This paper also discusses
standard logic circuits in combination with an array
structure to produce a component that can be used
efficiently in specific data processing areas.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5120 (Logic and switching circuits); C5210 (Logic
design methods)",
classification = "721",
corpsource = "IBM, Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access memory; array logic; array logic macros; array
logic structures; combinational logic; decoding;
feedback register; feedback registers; finite state
switching; internal; logic circuits; logic design;
macros; random; random access memory; random logic;
sequential logic",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Kasprzak:1975:PDP,
author = "L. Kasprzak and A. Hornung",
title = "Polarization and Depolarization in {PSG} Films",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "127--132",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Thin phosphosilicate glass (PSG) films are used
extensively throughout the semiconductor industry as
Na** plus ion barriers. The major disadvantage in using
PSG films in field effect transistor (FET) devices for
threshold voltage stabilization is that these films
polarize and therefore contribute to the shift in
threshold voltage. The demand for increased performance
of integrated circuits and for special applications
requiring precise threshold voltage control have made
it imperative to reexamine some aspects of PSG
polarization in more detail. A physical model has been
postulated to explain the observed effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340Q (Metal-insulator-semiconductor structures);
A7360H (Electronic properties of insulating thin
films); A7730 (Dielectric polarization and
depolarization effects); B2530F
(Metal-insulator-semiconductor structures); B2810
(Dielectric materials and properties)",
classification = "713; 714; 812",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "decay; depolarization; dielectric polarisation; FET
devices; glass; insulating thin films;
insulator-semiconductor devices; integrated circuits;
mechanism; metal-; phosphosilicate glass films;
polarization; PSG; semiconductor devices, field effect;
temperature dependence; temperature dependent
polarisation; threshold; transistors, field effect;
voltage shift",
treatment = "A Application; X Experimental",
}
@Article{MacDonald:1975:SHO,
author = "J. E. MacDonald and K. L. Sigworth",
title = "Storage Hierarchy Optimization Procedure",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "133--140",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents optimization techniques for a
storage hierarchy subject to quantity-sensitive
component costs. It is assumed that a finite (and
probably small) set of technologies is available. Each
technology is characterized by an access time and two
cost parameters. Solutions to four problems of
increasing complexity are presented: (1) minimization
of access time for a fixed cost and preassigned page
sizes; (2) optimization of a generalized
price-performance function under preassigned page
sizes; (3) minimization of access time for a fixed cost
when page sizes are allowed to vary; (4) optimization
of a generalized price-performance function when page
sizes are allowed to vary.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5310 (Storage system design); C6120 (File
organisation)",
classification = "722; 723",
corpsource = "IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access time; address; component costs; computer
operating systems --- Storage Allocation; cost
parameters; data storage, digital; file organisation;
Lagrange multipliers; memory hierarchy, Performance
Evaluation: Analytic; optimization; procedure;
statistics; storage hierarchies; storage hierarchy;
storage technologies; storage units",
treatment = "T Theoretical or Mathematical",
}
@Article{Ling:1975:BIC,
author = "H. Ling and F. P. Palermo",
title = "Block-Oriented Information Compression",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "141--145",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new scheme is presented for information compression
that does not use information statistics. Each
information block is represented by two sub-blocks
called the alphabet and the generator. The alphabet
contains the linearly independent elements; the
generator is computed through the linear combination of
the linearly dependent elements. The total length of
these two sub-blocks is generally shorter (never
greater) than the original block.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); C1260 (Information
theory); C6130 (Data handling techniques)",
classification = "723",
corpsource = "IBM, White Plains, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binary; binary number compression; CPUs; data base;
data bases; data compression; data processing;
information block; information compression; information
statistics; information theory; information theory ---
Data Compression; number reconstruction; one pass
algorithm; statistical analysis; statistics",
treatment = "T Theoretical or Mathematical",
}
@Article{Magdo:1975:HST,
author = "S. Magdo and I. Magdo",
title = "High Speed Transistor with Double Base Diffusion",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "146--150",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A high speed bipolar transistor has been fabricated by
using double base diffusion to reduce the base
resistance $R_B$. The base resistance forms two
important time constants, $R_{BCD}$ and $R_B
C_C(R_L/R_E)$ with the emitter diffusion capacitance
$C_D$ and collector capacitance $C_C$ dominating the
switching delay of the circuits. It is demonstrated
that the base resistance of a single base diffused
device can be reduced by a factor of four by using
double base diffusion without affecting its cut-off
frequency $f_t$ equals 7 GHz. The double base diffusion
also increases the punchthrough voltage of the device
from 3 to 7v.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550B (Semiconductor doping); B2560J (Bipolar
transistors)",
classification = "714",
corpsource = "IBM, East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "base resistance; bipolar transistors; breakdown;
collector capacitance; cut off frequency; double base
diffusion; emitter diffusion capacitance; high speed
transistor; impurity concentration; integrated
circuits; punchthrough voltage; semiconductor;
semiconductor doping; switches; switching delay;
transistors, bipolar; voltage",
treatment = "A Application; X Experimental",
}
@Article{Mader:1975:DGP,
author = "S. Mader and A. E. Blakeslee",
title = "On Dislocations in {GaAs$_{1-x}$P$_x$}",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "151--162",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Misfit dislocations in epitaxially grown layers of
GaAs$_{1-x}$P$_x$ with a lattice constant gradient are
examined by transmission electron microscopy. In
specimens with (113) A growth planes, they form a
three-dimensional arrangement of glissile and sessile
dislocations. Cross slip is an important process in the
generation of the dislocations. High resolution
microscopy shows (1) glissile dislocations dissociated
into partial dislocations and (2) undissociated sessile
Lomer dislocations. These differences are attributed to
contributions to the dislocation core energy from wrong
bonds and dangling bonds.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170 (Defects in crystals); A6855 (Thin film growth,
structure, and epitaxy); A8115 (Methods of thin film
deposition); B0510D (Epitaxial growth); B2550
(Semiconductor device technology)",
classification = "531; 712; 714; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cross slip; dislocations; dissociated dislocations;
electron microscope examination of materials; epitaxial
growth; epitaxially grown layers; GaAs/sub 1-x/P/sub;
gallium arsenide; glissile dislocations; III-V
semiconductors; Lomer dislocations; misfit; partial
dislocations; screw dislocations; semiconducting
gallium compounds; semiconductor diodes, light
emitting; sessile dislocations; transmission electron
microscopy; undissociated dislocations; x/",
treatment = "A Application; X Experimental",
}
@Article{Rosenberg:1975:WMA,
author = "A. L. Rosenberg and J. W. Thatcher",
title = "What is a Multilevel Array?",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "163--169",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "51 \#14627",
bibdate = "Mon Feb 12 08:06:14 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In intuitive terms, a multilevel array is either a
scalar or an array each of whose elements is a
multilevel array. The ``semantics'' of multilevel
arrays can be easily expressed in terms of a notion of
selector, which is basically that of the Vienna
Definition Language. These selectors provide both a
notational device for accessing multilevel arrays and a
clean mathematical definition of ``multilevel array
with data domain D.'' However, the definition so
obtained lacks the recursive flavor of the intuitive
definition. By means of an axiomatic characterization
of multilevel arrays, the selector-based definition and
the recursive definition are shown to be equivalent.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array access; data processing; data structures;
generalized arrays; multilevel; multilevel array;
multilevel arrays; subarrays",
reviewer = "W. D. Maurer",
treatment = "T Theoretical or Mathematical",
}
@Article{Lukes:1975:CSP,
author = "J. A. Lukes",
title = "Combinatorial Solution to the Partitioning of General
Graphs",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "170--180",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "05C99",
MRnumber = "51 \#12619",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reviews a dynamic programming procedure for
the partitioning of connected graphs with
integer-weighted nodes and positive valued edges. The
upper bound on the number of feasible partitions
generated using this technique is shown to grow
factorially in the number of graph nodes. The use of
graph properties is then introduced to reduce the
number of feasible partitions generated in the
determination of the optimal partition. Depending upon
the structure of the graph, the use of these properties
can cause a significant reduction in the computation
time and storage space required to partition the
graph.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); B0260 (Optimisation
techniques); C1160 (Combinatorial mathematics); C1180
(Optimisation techniques)",
classification = "921",
corpsource = "IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "combinatorial solution; computation time; connected
graphs; cutpoints; dynamic programming; graph theory;
graphs; isolated set; mathematical techniques; optimal
partitioning; partitioning algorithm; partitioning of
general; storage space",
reviewer = "Karel Culik",
treatment = "T Theoretical or Mathematical",
}
@Article{Urschler:1975:ASP,
author = "G. Urschler",
title = "Automatic Structuring of Programs",
journal = j-IBM-JRD,
volume = "19",
number = "2",
pages = "181--194",
month = mar,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "52 \#4695",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method is described that allows the translation of a
traditionally written (unstructured) program into a set
of top-down structured, semantically founded, GOTO-free
modules. The method reveals not only the logic of a
given program in a most natural way, but it also
reduces code duplication to a minimum. It is further
shown how the obtained structured program can be mapped
back into a GOTO program in such a way that all GOTOS
are backwards branches and their number is minimal. The
connection between recursively and iteratively
structured programs is demonstrated using the WHILE, DO
FOREVER, and multilevel EXIT statements. Extensions of
the method show the structuring of source programs
containing block structures and subroutines.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6110
(Systems analysis and programming)",
classification = "721; 723",
corpsource = "IBM, Vienna, Austria",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automata theory; automatic structuring; computer
programming; GOTO free modules; GOTO program; modular
programs; modules; program; program logic; programming
theory; recursive language; structured program; top
down structured; unstructured",
reviewer = "K. H. V. Booth",
treatment = "T Theoretical or Mathematical",
}
@Article{Bard:1975:APS,
author = "Y. Bard",
title = "Application of the {Page Survival Index} ({PSI}) to
Virtual-Memory System Performance",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "212--220",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Page Survival Index (PSI) was defined in a
preceding paper where it was used to describe the
behavior of individual programs running in a time
sharing environment. It is shown how a system-wide
value of PSI can be calculated on the fly by the
operating system. This value can be used to estimate
users' memory requirements and to control system
performance by maintaining the proper multiprogramming
level. Simulation results show that a scheduler based
on these concepts can achieve significant improvements
in system performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Data Processing Div., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming --- Multiprogramming;
computers; multiprogrammed virtual storage computer
system; multiprogramming; page; scheduling; survival
index; virtual storage",
treatment = "P Practical",
}
@Article{Bryant:1975:PWS,
author = "Peter Bryant",
title = "Predicting Working Set Sizes",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "221--229",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Empirical analyses of data on working set size are
reported. The data do not support the hypothesis that
working set sizes are normally distributed. The data
suggest various algorithms for predicting working set
size based on the program's past history. Several
representative algorithms are discussed and
evaluated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Data Processing Div., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers; operating systems; operating systems
(computers); predicting working set size; program's
working set; scheduling",
treatment = "X Experimental",
}
@Article{Freiberger:1975:PPR,
author = "W. F. Freiberger and U. Grenander and P. D. Sampson",
title = "Patterns in Program References",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "230--243",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "52 \#9661",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Papers on system performance evaluation.",
abstract = "This paper describes a study of some of the
characteristics of program referencing patterns.
Program behavior is investigated by constructing
stochastic models for the page reference mechanism and
evaluating the validity of the assumptions made through
comparison with empirical results. The notion of a
regime process is shown to play a useful role in
describing the observed phenomena mathematically. The
study falls within the realm of a rapidly growing field
of computer science known as compumetrics, where
quantitative and qualitative methods are being applied
to the study and evaluation of computer performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "Div. of Appl. Math., Brown Univ., Providence, RI,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compumetrics; computers; evaluation of computer;
modelling; multiprogramming; operating systems; page;
performance; program referencing patterns; reference
mechanism; stochastic models; virtual storage",
reviewer = "K. Vairavan",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Ferrari:1975:TPM,
author = "Domenico Ferrari",
title = "Tailoring Programs to Models of Program Behavior",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "244--251",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper considers the premise that, in addition to
trying to solve the virtual-memory-system performance
problem by devising a storage management strategy
suitable for the broad spectrum of behavior exhibited
by programs, efforts also be made to tailor the
behavior of each program to the model underlying the
storage management strategy under which the program
will have to run. It is observed that a viable approach
to program tailoring is offered by restructuring
techniques. The application of dynamic off-line
techniques to the tailoring problem is discussed, and
an algorithm which may be used to fit program behavior
to the working set model is described in detail as an
example. The performance of this algorithm in dealing
with two real-program traces is experimentally
evaluated under a variety of conditions and found to be
always satisfactory.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "Computer Sci. Div., Dept. of Electrical Engng., Univ.
of California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; dynamic off line
technique; management strategy; model of; program
behaviour; program tailoring; restructuring techniques;
virtual storage",
treatment = "A Application; P Practical",
}
@Article{Schatzoff:1975:DES,
author = "M. Schatzoff and C. C. Tillman",
title = "Design of Experiments in Simulator Validation",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "252--262",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is described, by example, how techniques of
statistical design and analysis of experiments have
been used to validate the modeling of the dispatching
algorithm of a time sharing system. The examples are
based on a detailed, trace-drive simulator of CP-67.
They show that identical factorial experiments
involving parameters of this algorithm, when carried
out on both the simulator and on the actual system,
produced statistically comparable effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems); C7430 (Computer
engineering)",
classification = "723",
corpsource = "IBM Data Processing Div., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming --- Time Sharing
Programs; computers; dispatching algorithm modelling;
simulation; simulator validation; statistical design
and analysis; time sharing system; time-sharing
programs",
treatment = "P Practical; X Experimental",
}
@Article{Chiu:1975:PAM,
author = "W. Chiu and D. Dumont and R. Wood",
title = "Performance Analysis of a Multiprogrammed Computer
System",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "263--271",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A combination of analytical modeling and measurement
is employed for the performance analysis of a
multiprogrammed computer system. First, a cyclic queue
model is developed for the system under study. Then,
model validation is attempted in both controlled and
normal environments. The success of the model is
demonstrated by its prediction of performance
improvements from system reconfigurations. Reasonable
correlation between the measured performance and the
model predictions under various degrees of
multiprogramming is observed. Finally, possible system
reconfigurations are explored with the insight gained
from the performance analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5400 (Analogue and digital computers and systems);
C6150G (Diagnostic, testing, debugging and evaluating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytical modelling; computer selection and
evaluation; computer system; computer systems
programming --- Multiprogramming; computers; cyclic
queue model; modelling; multiprocessing systems;
multiprogrammed; performance analysis; performance
improvements; prediction of",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Chang:1975:TRT,
author = "J. H. Chang",
title = "Terminal Response Times in Data Communications
Systems",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "272--282",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A response time analysis for a general class of
terminals-to-computer subsystem is presented. The model
used is based on the most advanced data communications
system in which terminals are connected to Terminal
Control Units (TCU) that are in turn connected to local
Front-End Processors (FEP). The line control procedures
used to interface a TCU and an FEP may be half-duplex
Binary Synchronous Communications (BSC), half-duplex
Synchronous Data Link Control (SDLC), or full-duplex
SDLC. The models presented can be used to determine
bottlenecks in the entire system and to facilitate the
initial phase of system design and configuration.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
classification = "723",
corpsource = "IBM Corporate Headquarters, Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers; data communication systems; front end; half
duplex binary synchronous communication; half or full
duplex synchronous data link control; line control
procedures; processors; remote consoles; terminal
control unit; terminal response time analysis",
treatment = "A Application; P Practical",
}
@Article{Reiser:1975:QNM,
author = "M. Reiser and H. Kobayashi",
title = "Queuing Networks with Multiple Closed Chains: Theory
and Computational Algorithms",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "283--294",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30",
MRnumber = "52 \#4464",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Papers on system performance evaluation.",
abstract = "A recent result of E. Baskett, K. M. Chandy, R. R.
Muntz, and F. G. Palacios is generalized to the case in
which customer transitions are characterized by more
than one closed Markov chain. Generating functions are
used to derive closed-form solutions to stability,
normalization constant, and marginal distributions. For
such a system with N servers and L chains the solutions
are considerably more complicated than those for
systems with one subchain only. It is shown how open
and closed subchains interact with each other in such
systems. Efficient algorithms are then derived from the
generating function representation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C4290 (Other computer theory); C5400 (Analogue and
digital computers and systems); C6150J (Operating
systems)",
classification = "723; 922",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytically solvable queueing networks; chain; closed
Markov; computational algorithms; computer engineering
applications of; computer systems programming;
computers; distributions; marginal; Markov processes;
multiple closed chains; multiprocessing systems;
normalization constant; probability --- Queueing
Theory; queueing theory; stability",
reviewer = "Izhak Rubin",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Herzog:1975:SQP,
author = "U. Herzog and L. Woo and K. M. Chandy",
title = "Solution of Queueing Problems by a Recursive
Technique",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "295--300",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25",
MRnumber = "52 \#1926",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Papers on system performance evaluation.",
abstract = "A recursive method for efficient computational
analysis of a wide class of queueing problems is
presented. Interarrival and service times are described
by multidimensional Markovian processes while arrival
and service rates are allowed to be state dependent.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C4290 (Other computer theory)",
classification = "922",
corpsource = "Univ. of Stuttgart, Stuttgart, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arrival and service; efficient computational analysis;
interarrival and; Markov processes; multidimensional
Markov processes; probability; queueing theory; rates;
recursive functions; recursive method; service times",
reviewer = "Izhak Rubin",
treatment = "T Theoretical or Mathematical",
}
@Article{Sauer:1975:AAC,
author = "C. H. Sauer and K. M. Chandy",
title = "Approximate Analysis of Central Server Models",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "301--313",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Service time distributions at computer processing
units are often nonexponential. Empirical studies show
that different programs may have markedly different
processing time requirements. When queueing disciplines
are first come, first served, preemptive priority or
nonpreemptive priority, models reflecting these
characteristics are difficult to analyze exactly.
Available approximate techniques are often too
expensive for parametric analysis. Inexpensive
approximate techniques for solution of central server
models with the above characteristics are presented.
The results of these techniques are validated with
simulation results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis of general; central server; computer systems
programming; inexpensive approximate technique; model;
multiprocessing systems; multiprogrammed computer
system; nonexponential service; queueing networks;
queueing theory",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Chow:1975:CSM,
author = "We Min Chow",
title = "Central Server Model for Multiprogrammed Computer
Systems with Different Classes of Jobs",
journal = j-IBM-JRD,
volume = "19",
number = "3",
pages = "314--320",
month = may,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30 (90B35)",
MRnumber = "54 \#8932",
bibdate = "Mon Feb 12 08:06:23 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Papers on system performance evaluation.",
abstract = "A computer system can usually be interpreted as a
closed network with two different types of servers. It
is then possible to convert the network into a single
server system with state-dependent arrivals. This paper
investigates the stationary behavior of a single server
queue with different classes of jobs. It is assumed
that the input process has state-dependent exponential
inter-arrival times and preemptions at the server are
not allowed. The exact solution is obtained by finding
the relationship between the time average probability
distribution and the departure average probability
distribution. The latter can be derived, based upon an
imbedded Markov Chain.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "average probability distribution; computer system;
computer systems programming; computers --- Selection
and Evaluation; departure average; Markov processes;
multiprocessing programs; multiprogrammed; probability
distribution; queueing theory; single server queue with
different classes of jobs; time",
reviewer = "F. G. Foster",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Berry:1975:VRI,
author = "B. S. Berry and W. C. Pritchet",
title = "Vibrating Reed Internal Friction Apparatus for Films
and Foils",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "334--343",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An apparatus is described which permits for the first
time the resolution of anelastic relaxation effects in
evaporated metallic thin films and ion-implanted
surface layers of silicon. The composite samples
consist of the film or layer of interest on a carrier
substrate having the form of a thin cantilevered reed.
Low external losses and an exceptionally good span of
operating frequencies are obtained by integrally
bonding the substrate to a supporting pedestal and by
using electrostatic drive and detection for the
transverse modes of vibration. The internal friction
can be measured with relatively simple instrumentation,
at pressures below 10** minus **5 torr (1.33 multiplied
by 10** minus **3 Pa) and over the temperature range
--- 190 degree C to 550 degree C. The apparatus has
considerable versatility for work in a number of areas,
including the investigation of metallic foils prepared
by splat-cooling.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0710 (Mechanical measurement methods and
instruments); A4630R (Mechanical measurement methods
and techniques for solids); A6240 (Anelasticity,
internal friction and mechanical resonances)",
classification = "539; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "-190 to 550 degrees C; anelastic relaxation effects;
anelastic relaxation measurement; anelasticity;
apparatus; carrier substrate; composite samples;
elasticity; electrostatic drive; films --- Metallic;
integrally bonded substrate; internal friction;
internal friction apparatus; ion implanted surface
layers; low external losses; mechanical variables
measurement; metallic foils; metallic thin films; modes
of vibration; pressures below 10/sup -5/ torr; range;
resonant method; splat cooled foils; thin cantilevered
reed; transverse; vibrating reed; wide frequency range;
wide temperature",
treatment = "G General Review; X Experimental",
}
@Article{Braun:1975:MHM,
author = "R. J. Braun",
title = "Modular {Hall} Masterslice Transducer",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "344--352",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Hall masterslice transducer combines modern IC
(integrated circuit) technology with a modular design
concept to provide a flexible multifunction approach to
magnetic sensing. Its sensing element, a controllable
Hall cell, is integrated with the associated circuitry
on a masterslice chip, mounted in a flux concentrator
module that forms the basic building block for diverse
application packages. The device has several auxiliary
control electrodes that allow fixed or externally
variable offset voltage control and magnetic field
simulation, as well as threshold, hysteresis, and gain
adjustments. Integral flux concentrators provide the
module with an efficient magnetic flux path and chip
cooling. Three application categories --- switches,
proximity sensors, and current sensors --- are
discussed and various application package designs are
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560F (Bulk effect devices); B2570 (Semiconductor
integrated circuits); B7230 (Sensing devices and
transducers)C3240D (Electric transducers and sensing
devices)",
classification = "714",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "auxiliary control electrodes; circuits; combined;
concentrator module; controllable Hall cell; current;
electric sensing devices; flexible; flux; Hall effect
transducers; hall effect transducers; Hall masterslice
transducer; Hall transducers; IC masterslice;
IC/modular transducer; magnetic; modular design;
monolithic integrated circuits; multifunction approach;
offset; proximity sensors; sensors; switches; voltage
control",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Bennett:1975:LSP,
author = "B. T. Bennett and V. J. Kruskal",
title = "{LRU} stack processing",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "353--357",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "52 \#2303",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Stack processing, and in particular stack processing
for the least recently used replacement algorithms, may
present computational problems when it is applied to a
sequence of page references with many different pages.
This paper describes a new technique for
least-recently-used (LRU) stack processing that permits
efficient processing of these sequences. An analysis of
the algorithm and a comparison of its running times
with those of the conventional stack processing
algorithms are presented. Finally a multipass
implementation is discussed, which was found necessary
to process trace data from a large data base system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer programming; data
base system; file organisation; large; least recently
used; LRU stack processing; multipass implementation;
process trace data; processing; replacement algorithms;
running; sequence of page references; stack processing;
stack processing algorithm; times; trace data",
reviewer = "Frank K. Hwang",
treatment = "N New Development; T Theoretical or Mathematical",
}
@Article{Hong:1975:CSA,
author = "S. J. Hong and D. L. Ostapko",
title = "Codes for Self-Clocking, {AC}-Coupled Transmission:
Aspects of Synthesis and Analysis",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "358--365",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Nonreturn-to-zero-inverse (NRZI) waveform codes are
considered that satisfy a given set of run-length
constraints and the upper bound on the accumulated DC
charge of the waveform. These constraints enable the
codeword to be self-clocking, ac-coupled, and suitable
for data processing tape and communication
applications. Various aspects of synthesis and analysis
of such codes, called (d,k,C) codes, are illustrated by
means of several examples. The choice of the initial
state of the encoder is shown to influence the length
of the data sequence over which the encoder must
look-ahead.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6210Z (Other data transmission);
C5320C (Storage on moving magnetic media); C5600 (Data
communication equipment and techniques)",
classification = "723",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(d, k, C) codes; AC-coupled transmission; analysis;
binary data; binary sequences; codes; codes, symbolic;
communication codes; computers; constraints; data
transmission; digital communication systems; encoder
look ahead; encoding; initial states; magnetic;
magnetic recording; magnetic tape storage; NRZI
waveform; recording; run length; self clocking codes;
synthesis",
treatment = "T Theoretical or Mathematical",
}
@Article{Patel:1975:ZEM,
author = "A. M. Patel",
title = "Zero-Modulation Encoding in Magnetic Recording",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "366--378",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A10",
MRnumber = "54 \#9841",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with waveform encoding methods in
which binary data are mapped into constrained binary
sequences for shaping the frequency spectrum of
corresponding waveforms. Short and long pulse widths in
the waveform are limited by constraints on the minimum
and maximum run-lengths of zeros in the coded
sequences. These constraints reduce the intersymbol
interference in magnetic recording and provide an
adequate rate of transition for accurate clocking.
Signal power at low frequencies is limited by means of
a constraint on a parameter that corresponds to the
maximum imbalance in the number of positive and
negative pulses of the waveform. This constraint on the
maximum accumulated DC charge also eliminates the
zero-frequency component. Zero modulation is one such
code that is especially suitable for magnetic recording
channels. The encoding and decoding algorithm is
presented. A one-to-one correspondence between binary
data and constrained sequences is established by
creating data states that are isomorphic to the charge
states having the same growth rate. Sequences with
other values of run-length and charge constraint are
examined as candidates for other codes with zero DC
component.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C5320C (Storage on moving magnetic
media)",
classification = "722",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binary data; binary sequences; charge constraint;
constrained binary sequences; data storage, magnetic;
DC; encoding; frequency spectrum shaping; intersymbol
interference; magnetic; magnetic recording; modulation
encoding; pulse; rate of transition for clocking; tape
storage; waveform encoding method; widths constraints;
zero; zero DC component",
reviewer = "A. D. Wyner",
treatment = "T Theoretical or Mathematical",
}
@Article{Wood:1975:HDP,
author = "R. A. Wood",
title = "High-Speed Dynamic Programmable Logic Array Chip",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "379--383",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the circuit design of a
programmable logic array (PLA) chip using four-phase
dynamic circuits, operating at a nominal cycle time of
230 nanoseconds. Bootstrap circuit techniques are used
to obtain high function and performance by satisfying
some special requirements of PLA designs. These include
a simple means for two-bit partitioning of the data
inputs, a noninverting buffer circuit between
precharged arrays, and a fast, compact on-chip driver
for heavily loaded arrays. Multiphase clocking enables
the use of master\slash slave type JK flip-flops with
minimum circuitry and power dissipation. A polarity
hold function is provided at the outputs to allow
interfacing the dynamic design to static output
circuits.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1260 (Pulse circuits); B1265 (Digital electronics);
B2560S (Other field effect devices); B2570
(Semiconductor integrated circuits); C5120 (Logic and
switching circuits)",
classification = "721",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "230 ns cycle time; bootstrap; buffer circuit; circuit;
circuit design; circuits; digital integrated circuits;
field effect transistors; four phase dynamic; high
speed logic array; hold circuit; JK flipflops; logic;
logic devices; monolithic integrated circuits;
multiphase clocking; noninverting; programmable logic
array chip; two bit partitioning",
treatment = "N New Development; X Experimental",
}
@Article{Miranker:1975:IDF,
author = "W. L. Miranker and A. Morreeuw",
title = "Interpolation with discontinuous functions:
{Application} to calculation of shocks",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "384--397",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76.65",
MRnumber = "51 \#9661",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "317.65004",
abstract = "An interpolation procedure, which uses a step function
plus a polynomial correction, is devised and studied
for application to the numerical solution of problems
having discontinuous solutions. The interpolation
procedure is applied to the calculation of shock waves
produced by a single convex conservation law. The
resulting algorithm does not have the usual undesirable
numerical features associated with shock-wave
calculations. The stability and convergence of the
algorithm is also demonstrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0340D (Mathematical theory of elasticity); A4630M
(Vibrations, aeroelasticity, hydroelasticity,
mechanical waves, and shocks); B0290F (Interpolation
and function approximation); C4130 (Interpolation and
function approximation)",
classification = "631; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm convergence; algorithm stability;
calculation of shocks; conservation law; discontinuous
functions; interpolation; interpolation procedure;
numerical methods; polynomial correction; shock waves;
shockwave calculations; single convex; step function",
reviewer = "G. A. Watson",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Rosenbaum:1975:MOP,
author = "W. S. Rosenbaum and J. J. Hilliard",
title = "Multifont {OCR} Postprocessing System",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "398--421",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A series of techniques is being developed to
postprocess noisy, multifont, nonformatted Optical
Character Reader (OCR) data on a word basis to (1)
determine if a field is alphabetic or numeric; (2)
verify that an alphabetic word is legitimate; (3) fetch
from a dictionary a set of potential entries using a
garbled word as a key; and (4) error-correct the
garbled word by selecting the most likely dictionary
word. Four algorithms were developed using a technique
called vector processing (representing alphabetic words
as numeric vectors) and also by applying Bayes maximum
likelihood solutions to correct the OCR output. The
result was the development of a software simulator
which processed sequential fields generated by the
Advanced Optical Character Reader (in use by the U. S.
Postal Service in New York City), performed the four
functions indicated above, and selected the correct
alphabetic word from a dictionary of 62,000 entries.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
classification = "723; 741",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alphabetic; Bayes maximum likelihood solutions;
character recognition, optical; error correction;
garbled word; most likely dictionary word; multifont
OCR; noisy OCR data; nonformatted OCR; OCR; OCR output
correction; optical character recognition;
postprocessing system; simulator; software; vector
processing; word processing; words",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Suits:1975:FBT,
author = "J. C. Suits",
title = "Ferromagnetism in {Bi}- and {Te}-substituted {MnRh}",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "422--423",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A series of experiments shows that substitution of Bi
into antiferromagnetic MnRh causes this alloy to become
ferromagnetic. The Curie temperature of (Mn$_0$.
//8Bi$_0$. $_2$) Rh is 185 degree K and the moment is
3.5 $\mu_B$ per formula unit. Substitution of Te
instead of Bi gives similar results. This effect is
consistent with a model of competitive ferromagnetic
and antiferromagnetic exchange in MnRh-type
compounds.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7530C (Magnetic moments and susceptibility in
magnetically ordered materials); A7530E (Exchange and
superexchange interactions in magnetically ordered
materials); A7530K (Magnetic phase boundaries); A7550E
(Antiferromagnetics); A7550 (Studies of specific
magnetic materials); B3110C (Ferromagnetic materials)",
classification = "708",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(electron); antiferromagnetic exchange; Bi; bismuth
alloys; competitive ferromagnetic and; Curie
temperature; exchange interactions; ferromagnetic
metals; ferromagnetic properties of substances;
ferromagnetism; magnetic; manganese alloys; Mn/sub
0.8/Bi/sub 0.2/Rh; Mn/sub 0.8/Te/sub 0.2/Rh; moments;
rhodium alloys; substituted MnRh; Te substituted MnRh;
tellurium alloys",
treatment = "X Experimental",
}
@Article{Stacy:1975:CBQ,
author = "E. W. Stacy",
title = "Comment on: {``Bulk queue model for computer system
analysis''} {(IBM J. Res. Develop. {\bf 18} (1974),
370--372) by W. Chang}",
journal = j-IBM-JRD,
volume = "19",
number = "4",
pages = "424--424",
month = jul,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30",
MRnumber = "51 \#11719",
bibdate = "Mon Feb 12 08:12:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Chang:1974:BQM}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C1290 (Applications of systems theory)",
corpsource = "IBM System Products Div. Lab., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bulk queue; computer system analysis; model;
modelling; modified assumptions; operations research;
queueing theory; results interpretation",
reviewer = "J. G. C. Templeton",
treatment = "T Theoretical or Mathematical",
}
@Article{Fernandez:1975:CLB,
author = "E. B. Fern{\'a}ndez and T. Lang",
title = "Computation of Lower Bounds for Multiprocessor
Schedules",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "435--444",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B35 (68A99)",
MRnumber = "53 \#7437",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A multiprocessing system composed of identical units
is considered. This system is executing a set of
partially ordered tasks, with known execution times,
using a nonpreemptive scheduling strategy. Lower bounds
on the number of processors required to compute the
tasks before a deadline, and on the minimum time to
execute the tasks with a fixed number of processors,
are of great value for the determination of the
corresponding optimal schedules. In this paper, methods
for the efficient computation of the lower bounds
obtained by E. Fernandez and B. Bussell are discussed.
Computational improvements for the case of general
partial orders are reported, and further reductions of
the number of operations are shown to be possible for
special graphs (trees, independent chains, independent
tasks).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "723",
corpsource = "Data Processing Div., IBM Sci. Center, Los Angeles,
CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; execution times; general
partial; graphs; identical processors; lower bounds;
lower bounds computation; multiprocessing;
multiprocessing systems; multiprocessor schedules;
multiprocessor scheduling theory; nonpreemptive; number
of processors; optimal schedules; orders; scheduling
strategy; set of partially ordered tasks; system",
reviewer = "Sven-{\AA}ke Gustafson",
treatment = "T Theoretical or Mathematical",
}
@Article{Ghanem:1975:DPM,
author = "M. Z. Ghanem",
title = "Dynamic Partitioning of the Main Memory Using the
Working Set Concept",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "445--450",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B05 (68A50)",
MRnumber = "52 \#16555",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An algorithm to divide the main memory among N
competing programs with different characteristics,
running in a multiprogramming and virtual memory
environment, is proposed. The algorithm is based on an
optimal allocation policy, which is derived in this
paper, using the concept of the working set. A brief
description of the hardware implementation of the
algorithm is also presented. It is shown that under
this optimal allocation policy ``the value of a
page-frame'' (the amount of reduction in the page fault
rate if an additional page frame is allocated to that
program) to each program is the same.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; computer operating systems; computer
systems programming --- Multiprogramming; dynamic;
environment; hardware implementation; main memory;
memory partitioning; multiprogramming; N competing;
optimal allocation; page fault rate; page frame value;
partitioning; policy; programs; variable partitioning;
virtual memory environment; virtual storage; working
set concept",
reviewer = "Rainer Burkard",
treatment = "T Theoretical or Mathematical",
}
@Article{Ghanem:1975:SMP,
author = "M. Z. Ghanem",
title = "Study of Memory Partitioning for Multiprogramming
Systems with Virtual Memory",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "451--457",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B05 (68A50)",
MRnumber = "52 \#16556",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The effect that the shape of the lifetime function has
on the optimal partition of the main memory of a
computer among $N$ programs, where the criterion of
optimality is maximization of CPU utilization is
investigated. A simple queueing model is used as a base
for understanding this interrelationship. The lifetime
function is the average of the execution intervals of a
program as a function of the amount of memory
allocated. When the lifetime function is convex and is
proportional to $m^\alpha$, where $m$ is the size of
memory, then the optimal partition is obtained by
dividing the main memory equally among $q$ of the $N$
programs ($q$ is the optimal degree of
multiprogramming). Thus, the best partition is always
one of two policies: allocate all memory equally among
the $q$ programs or allocate all memory to one program.
When the lifetime function has a degenerate $S$ shape
(is proportional to $m^\alpha$ when $m \leq m_0$ and
remains constant beyond $m_0$), then there exists a
memory size $m$ such that no program can have a memory
size other than $m$ or $m_0$; if any program has a
memory size greater than $m_0$, each other program
should have a memory size that is equal to or greater
than $m_0$.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer system; computer
systems programming --- Multiprogramming; CPU
utilisation maximisation; criterion of optimality;
dynamic partitioning; execution; intervals; lifetime
function; main memory; memory; memory partitioning;
multiprogramming; multiprogramming systems; N; optimal
partition; programs; queueing model; virtual; virtual
memory; virtual storage",
reviewer = "Rainer Burkard",
treatment = "T Theoretical or Mathematical",
}
@Article{Lavenberg:1975:IRS,
author = "S. S. Lavenberg and D. R. Slutz",
title = "Introduction to Regenerative Simulation",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "458--462",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A recently developed method for estimating confidence
intervals when simulating stochastic systems having a
regenerative structure is reviewed. The paper is
basically tutorial, but also considers the pragmatic
issue of the simulation duration required to obtain
valid estimates. The method is illustrated in terms of
simulating the M/G/1 queue. Analytic results for the
M/G/1 queue are used to determine the validity of the
simulation results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1220 (Simulation, modelling and identification)",
classification = "922",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "intervals; M/G/1 queue; method for estimating
confidence; probability; queueing theory; Queueing
Theory; regenerative; regenerative simulation;
simulating stochastic systems; simulation; simulation
duration; statistical methods; stochastic systems;
structure",
treatment = "T Theoretical or Mathematical",
}
@Article{Lavenberg:1975:RSQ,
author = "S. S. Lavenberg and D. R. Slutz",
title = "Regenerative Simulation of a Queueing Model of an
Automated Tape Library",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "463--475",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recently, techniques have been developed for
estimating confidence intervals when simulating
stochastic systems having a regenerative structure.
These techniques are applied to the simulation of a
queueing model of a computer system's automated tape
library. Theoretical and practical issues related to
the application of these techniques are addressed. An
interesting feature of the automated tape library
represented in the queueing model is that certain
queues have finite capacity; when these queues are
filled to capacity certain services are prevented from
occurring. The regenerative techniques are used in
conjunction with multiple comparison procedures to make
statistically valid statements about the effect of the
finite queue capacities on performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310 (EDP management); C6150J (Operating systems)",
classification = "723; 922",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated tape library; computer installation;
computer systems programming; estimating confidence
intervals; finite queue capacities; multiple comparison
procedures; probability; queueing models; queueing
theory; regenerative; regenerative structure;
simulating stochastic systems; simulation; statements;
statistically valid; stochastic systems",
treatment = "T Theoretical or Mathematical",
}
@Article{Chang:1975:SSQ,
author = "W. Chang",
title = "Sequential Server Queues for Computer Communication
System Analysis",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "476--485",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30 (68A99)",
MRnumber = "52 \#12124",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "343.68032",
abstract = "A queueing model with two sequential servers is
developed to analyze performance in computer and
communication systems. In one case the CPU is the first
server and the terminal and its associated
communications equipment are the second server. In a
second case the CPU and the channel are the first
server and the auxiliary storage device is the second
server. The queueing behavior of the sequential server
systems with Poisson arrivals, general service time
distributions, and several service disciplines,
including bulk arrivals, message priorities, and the
input and output queues. The stationary distributions
of the queue lengths and waiting times are determined
by using an imbedded Markov chain analysis. Several
examples are given to illustrate the applications of
these models to practical problems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6210L (Computer
communications); C1140C (Queueing theory); C5620
(Computer networks and techniques)",
classification = "723; 922",
corpsource = "Data Processing Div. Headquarters, White Plains, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bulk arrivals; chain analysis; communication; computer
networks; computer systems; computers; distributions;
general service time distributions; imbedded Markov;
input queues; message priorities; output queues;
Poisson arrivals; probability --- Queueing Theory;
queue lengths; queueing behaviour; queueing models;
queueing theory; sequential server queues; sequential
server systems; service disciplines; stationary; system
analysis; systems; telecommunication; two sequential
servers; waiting times",
reviewer = "Erol Gelenbe",
treatment = "T Theoretical or Mathematical",
}
@Article{Wu:1975:ALT,
author = "R. M. Wu and Yen Bin Chen",
title = "Analysis of a Loop Transmission System with
Round-Robin Scheduling of Services",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "486--493",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30 (65C05)",
MRnumber = "52 \#12125",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A finite population, multiqueue model is developed for
a loop transmission system. Approximate expressions for
the state transition matrix and other system variables
are derived in recursive forms. It is also shown that a
number of useful system parameters, such as average
message response time, average cycle time, and average
response time conditioned on message length, can be
obtained. The analytical results have been validated by
simulation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)B6210Z (Other data transmission); C1140C
(Queueing theory)",
classification = "922",
corpsource = "IBM Systems Communications Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "average cycle; average message response time;
conditioned response time; finite; loop transmission
system; message length; multiqueue model; parameters;
population models; probability; queueing theory;
recursive expressions; round robin scheduling; state
transition matrix; switching networks; system; time",
reviewer = "Erol Gelenbe",
treatment = "T Theoretical or Mathematical",
}
@Article{Herzog:1975:OSS,
author = "U. Herzog",
title = "Optimal Scheduling Strategies for Real-Time
Computers",
journal = j-IBM-JRD,
volume = "19",
number = "5",
pages = "494--504",
month = sep,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B35 (68A99 60K30)",
MRnumber = "53 \#12559",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In order to fulfill response time constraints in
real-time systems, demands are often handled by means
of sophisticated scheduling strategies. This paper
first shows how to describe and analyze arbitrary
combinations of preemptive and nonpreemptive
(head-of-the-line) priority strategies and, second,
presents an algorithm that yields the optimal priority
strategy, taking into consideration constraints on the
response time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5400 (Analogue and digital computers and systems);
C6150J (Operating systems)",
classification = "723",
corpsource = "Inst. Switching Techniques and Data Processing, Univ.
of Stuttgart, Stuttgart, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "combined; computer systems, digital; nonpreemptive
strategies; optimal priority strategy; optimal
scheduling strategies; optimisation; preemptive
strategies; preemptive/nonpreemptive strategies;
priority; real time computers; real-time systems;
response time constraints; scheduling; scheduling
strategies; strategies",
reviewer = "I. Vaduva",
treatment = "T Theoretical or Mathematical",
}
@Article{Tu:1975:TLI,
author = "Y. O. Tu",
title = "Theory of Liquid Ink Development in
Electrophotography",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "514--522",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When an electric field is present across two different
fluid dielectrics having a common plane boundary, some
disturbances in the interfacial boundary are found to
grow in time. The liquid ink development process is
viewed as the result of varying instability of the
oil-ink interface as a function of the differing field
gradient in light and dark areas of the exposed image.
In an analysis of the disturbances into normal modes,
the theory relates the effects upon instability due to
potential difference across the oil, the surface
tension, the respective viscosities of the oil and the
ink, and the finite thicknesses of the oil, ink, and
the photoconductor layer. The threshold potential
difference for the onset of instability is also
given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0768 (Photography, photographic instruments and
techniques)",
classification = "742; 745",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "differing field; electrophotography; gradient; liquid
ink development; normal modes; oil ink interface
instability; photographic reproduction; potential
difference; printing --- Electrostatic; surface;
tension; thickness dependence; viscosities",
treatment = "T Theoretical or Mathematical",
}
@Article{Dimsdale:1975:MS,
author = "B. Dimsdale and K. Johnson",
title = "Multiconic Surfaces",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "523--529",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D10",
MRnumber = "52 \#12293",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "323.50003",
abstract = "Multiconic surfaces are a generalization of the type
of surface called polyconic in numerical control of
machine tools. The general theory is developed in this
paper using a new parametrization. In the original form
there was a problem as to whether or not a point that
satisfies surface equations actually belonged to the
intended surface. This difficulty is removed by the new
technique. Algorithms for calculation of line and plane
intersections with the surface and for calculation of
normal vectors, volume, and surface area are given for
classes of defining functions of which it is required
only that they have appropriate conditions of
continuity and differentiability.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1310 (Control system analysis and synthesis methods);
C3355Z (Control applications in other manufacturing
processes)",
classification = "603; 731",
corpsource = "IBM Los Angeles Sci. Center, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "control systems, numerical --- Computer Applications;
equations; line intersections; machine tools;
multiconic; normal vectors; numerical control;
numerically-controlled machine tools; parametrization;
plane intersections; processing times; spline
functions; surface; surface area; surfaces; volume",
reviewer = "J. Buchanan",
treatment = "T Theoretical or Mathematical",
}
@Article{Wang:1975:TVC,
author = "P. P. Wang and O. S. Spencer",
title = "Threshold Voltage Characteristics of
Double-Boron-Implanted Enhancement-Mode {MOSFETs}",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "530--538",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Threshold voltage characteristics are presented for a
double boron-ion-implanted n-channel enhancement MOSFET
device for high speed logic circuit applications. A 15-
OMEGA -cm high resistivity p-type (100) substrate was
used to achieve low junction capacitance and low
threshold substrate sensitivity. A shallow boron
implant was used to raise the threshold voltage, and a
second, deeper, boron implant was used to increase the
punch-through voltage between the source and the drain.
This design is especially beneficial for short channel
devices, while maintaining the low junction capacitance
and low threshold substrate sensitivity of the high
resistivity substrate.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices)",
classification = "712; 714",
corpsource = "IBM System Communications Div. Lab., Kingston, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "capacitance; dimensional analysis; double B implanted;
enhancement mode MOSFET; field effect transistors; high
speed logic circuit applications; low junction; low
threshold substrate sensitivity; one; punch through
voltage; quasi two dimensional analysis; semiconductor
materials --- Ion Implantation; short channel effect;
threshold; transistors, field effect; voltage",
treatment = "T Theoretical or Mathematical",
}
@Article{Dave:1975:CIS,
author = "J. V. Dave and P. Halpern and H. J. Myers",
title = "Computation of Incident Solar Energy",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "539--549",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Computations of the daily and annual totals of the
solar energy incident upon south-facing tilted flat
surfaces were carried out for several cloud-free
atmospheric models after taking into account, somewhat
arbitrarily, the contribution due to sky radiation and
that due to radiation reflected by the ground.
Representative variations of these quantities are
discussed as a function of several parameters such as
geographical latitude of the location, tilt angle of
the surface, atmospheric transmission characteristics,
sky-radiation contribution, and ground reflectivity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9260 (Lower atmosphere)",
classification = "657",
corpsource = "IBM Data Processing Div. Sci. Center, Palo Alto, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atmospheric; cloudfree atmospheric models; facing
tilted flat surface; geographical latitude; ground
reflectivity; incident solar energy; radiation; sky;
solar power; solar radiation; south; sunlight; tilt
angle; transmission characteristics",
treatment = "T Theoretical or Mathematical",
}
@Article{Easton:1975:MID,
author = "M. C. Easton",
title = "Model for Interactive Data Base Reference String",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "550--556",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "55 \#7001",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A particularly simple Markov chain model for a
reference string is described. The model, which is only
slightly more complicated than the independent
reference model, generates strings that have a locality
property and that have a specified probability
distribution of references over pages. Expressions are
obtained for expected working-set size and expected
working-set miss ratio. The model is used in an
examination of the effect of grouping pages into blocks
and in a discussion of the problem of evaluating the
effect of changes in the size of the data base.
Predictions of the model are shown to agree closely
with observations of a string of data base references
generated by an interactive data base system having a
large number of concurrent users.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, digital; distribution; effect of
grouping pages into blocks; file organisation;
interactive data base reference string; interactive
data base system; locality property; Markov chain
model; Markov processes; reference probability; working
set miss ratio; working set size",
reviewer = "Petre Preoteasa",
treatment = "T Theoretical or Mathematical",
}
@Article{Flehinger:1975:HSC,
author = "B. J. Flehinger and R. L. {Engle, Jr.}",
title = "{Heme}: a Self-Improving Computer Program for
Diagnosis-Oriented Analysis of Hematologic Diseases",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "557--564",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "HEME, a computer program for diagnosis-oriented
analysis of hematologic diseases, accepts as input
information about a patient and provides as output an
ordered list of suggested diagnoses, an analysis of the
logic behind these diagnoses, and a list of tests
relevant to these diagnoses and not yet performed. The
decision algorithm is based on Bayes' Theorem. Each
disease in the system is individually analyzed, and the
probability that the patient has the disease vs the
probability that he does not is calculated. Bayesian
methods of statistical inference are utilized in that
the prior probabilities of the diseases and the
probabilities of findings in given diseases were
initially estimated from the judgement of experienced
hematologists with the intention that they be modified
automatically as data are accumulated. This program is
intended for use in teaching hematology, as an aid to
diagnosis, and as a means for studying the diagnostic
process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7330 (Biology and medical computing)",
classification = "461; 462; 723; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Bayes methods; Bayes' Theorem; biomedical applications
of computers; biomedical engineering; decision
algorithm; diagnosis; haematologic diseases; oriented
analysis; patient; probability --- Computer
Applications; self improving computer program;
statistical inference; teaching",
treatment = "P Practical",
}
@Article{Ho:1975:MNA,
author = "C. W. Ho",
title = "Modified Nodal Approach to {DC} Network Sensitivity
Computation",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "565--574",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "55 \#2380",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Programming techniques are presented for computing DC
sensitivity vectors of nonlinear electronic circuits.
The modified nodal approach is used as the method of
formulation for the circuit equations, in which
multiple performance objectives can be accommodated.
Numerical examples illustrate some of the techniques
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1160 (Nonlinear network analysis and design)",
classification = "703",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit equations; computer-aided circuit design; DC
network sensitivity; electric networks; modified nodal
approach; multiple; nonlinear electronic circuits;
nonlinear network analysis; performance objectives;
programming techniques; sensitivity analysis",
reviewer = "Jerrold S. Rosenbaum",
treatment = "T Theoretical or Mathematical",
}
@Article{Pazel:1975:MCP,
author = "D. P. Pazel",
title = "Mathematical Construct for Program Reorganization",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "575--581",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05",
MRnumber = "52 \#9664",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A mathematical formalism is described through which a
program is given a symbolic representation and, with
the application of several basic formulas, may be
transformed into a equivalent representation giving
rise to a reorganized program. Examples are given in
which programs are simplified (e.g., code is reduced)
or reorganized into a structured form. In effect a
mathematics is described that applies to programs in
much the same manner as Boolean algebra applies to
switching circuits.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6110
(Systems analysis and programming)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; equivalent representation;
mathematical formalism; program reorganization; program
simplification; programming theory; representation;
structured form; structured programming; symbolic",
reviewer = "Andrzej Blikle",
treatment = "T Theoretical or Mathematical",
}
@Article{Lew:1975:SRB,
author = "J. S. Lew",
title = "On some relations between the {Laplace} and {Mellin}
transforms",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "582--586",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "44A15",
MRnumber = "52 \#8808",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Several earlier papers have applied some identities
relating the Laplace and Mellin transforms; this note
develops certain such identities, achieving greater
generality and rigor. Specifically each of these
transforms is expressed as a contour integral involving
the other, and an expansion of the Laplace transform is
derived in terms of the functions (s multiplied by
(times) d/ds)**n(1 plus s)** minus **1 with
coefficients defined by the Mellin transform.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0230 (Integral transforms); C1130 (Integral
transforms)",
classification = "921",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "contour integral; Laplace transform; Laplace
transforms; mathematical transformations; Mellin
transform; relations between transforms; transforms",
reviewer = "V. M. Bhise",
treatment = "T Theoretical or Mathematical",
}
@Article{Schneider:1975:AGF,
author = "J. Schneider",
title = "Amorphous {GdCoCr} Films for Bubble Domain
Applications",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "587--590",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Amorphous GdCoCr films of various composition ratios
made by RF bias sputtering are investigated for their
applicability as bubble domain supporting
materials. Film compositions around
{Gd$_{0.13}$Co$_0$_6.5Cr$_{0.2}$}$_2$ have
temperature--insensitive magnetizations between 240 K
and 350 K with T(comp) approximately equals 120 K and
T$_c$ approximately equals 630 K. Reduction of the Cr
content from 21.8 to 20.3 at. percent causes an
increase of the magnetization by a factor of
three. Thermal cycling of these films between 290 K and
570 K does not change the magnetization noticeably, nor
does annealing for up to six days at 520 K.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7550 (Studies of specific magnetic materials); A7560E
(Magnetization curves, hysteresis, Barkhausen and
related effects); A7570K (Domain structure in magnetic
films (magnetic bubbles)); B3110C (Ferromagnetic
materials); B3120L (Magnetic bubble domain devices);
B3120N (Magnetic thin film devices)",
classification = "708; 721",
corpsource = "German Mfg. Technol. Center, IBM, Sindelfingen, West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.13/Co/sub 0.65/Cr/sub 0.22/; alloys; amorphous;
amorphous state; bubble domain applications; chromium
alloys; cobalt alloys; contamination; data storage,
magnetic --- Bubbles; films; gadolinium; Gd/sub; heat
treatment of alloys; magnetic; magnetic bubbles;
magnetic materials; magnetisation; magnetizations;
O/sub 2/; RF bias sputtering; temperature sensitivity;
thermal cycling; thin films",
treatment = "X Experimental",
}
@Article{Talke:1975:EST,
author = "F. E. Talke and R. C. Tseng",
title = "Effect of Submicrometer Transducer Spacing on the
Readback Signal in Saturation Recording",
journal = j-IBM-JRD,
volume = "19",
number = "6",
pages = "591--596",
month = nov,
year = "1975",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental results for frequency response and
halfpulse width of digital recording signals have been
obtained for submicrometer transducer spacings, for the
case of a flexible disk flying in close proximity to a
rigidly mounted conventional ferrite recording head.
Using optical flying heights rather than an ``effective
spacing'', together with a modification of the M.
Williams --- R. Comstock write-process slope criterion,
an excellent agreement between experimental results and
theoretical predictions is obtained. This suggests that
the notion of effective spacing can be avoided.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120W (Other magnetic
material applications and devices); C5320C (Storage on
moving magnetic media)",
classification = "721; 722",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Comstock write process slope criterion; data storage,
magnetic; digital recording signals; ferrite recording
head; flexible disc; frequency response; half pulse
width; magnetic disc and drum storage; magnetic
recording; optical flying heights; readback signal;
rigidly mounted conventional; saturation recording;
submicrometer transducer spacing; Williams",
treatment = "X Experimental",
}
@Article{Cooper:1976:DOS,
author = "Arthur E. Cooper and Wen T. Chow",
title = "Development of On-Board Space Computer Systems",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "5--19",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the functions, characteristics,
requirements, and design approaches of the on-board
computers for seven space vehicles --- Saturn I,
Orbiting Astronomical Observatory, Gemini, Saturn IB,
Saturn V, Skylab, and Space Shuttle. The data contained
in this paper represent an encapsulation of sixteen
years of space-borne-computer development. In addition,
the evolution of computer characteristics such as size,
weight, power consumption, computing speed, memory
capacity, technology, architectural features, software,
and fault-tolerant capabilities, is summarized and
analyzed to point out the design trends and the
motivating causes. The evolution in utilization of the
on-board computers; their interface with sensors,
displays, and controls; and their interaction with
operators are summarized and analyzed to show the
increasing role played by computers in the overall
space-vehicle system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9480 (Instrumentation and techniques for aeronomy,
space physics, and cosmic rays); B7630 (Avionic systems
and aerospace instrumentation); C7300 (Natural sciences
computing); C7490 (Computing in other engineering
fields)",
classification = "655; 656; 722; 723",
corpsource = "IBM Federal Systems Div., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace applications of computers; aerospace
control; aerospace instrumentation; characteristics;
computer architecture --- Microprogramming; computer
systems programming; computer systems, digital ---
Fault Tolerant Capability; computers; computers ---
Aerospace Applications; design; functions; natural
sciences applications of; onboard systems; reviews;
space computer systems; space vehicles",
treatment = "G General Review",
}
@Article{Sklaroff:1976:RMT,
author = "Joel R. Sklaroff",
title = "Redundancy Management Technique for Space Shuttle
Computers",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "20--28",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes how a set of off-the-shelf
general purpose digital computers is being managed in a
redundant avionic configuration while performing
flight-critical functions for the Space Shuttle. The
description covers the architecture of the redundant
computer set, associated redundancy design
requirements, and the technique used to detect a failed
computer and to identify this failure on-board to the
crew. Significant redundancy management requirements
consist of imposing a total failure coverage on all
flight-critical functions, when more than two redundant
computers are operating in flight, and a maximum
failure coverage for limited storage and processing
time, when only two are operating. The basic design
technique consists of using dedicated redundancy
management hardware and software to allow each computer
to judge the ``health'' of the others by comparing
computer outputs and to ``vote'' on the judgments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9480 (Instrumentation and techniques for aeronomy,
space physics, and cosmic rays); B7630 (Avionic systems
and aerospace instrumentation); C7490 (Computing in
other engineering fields)",
classification = "655; 722; 723",
corpsource = "IBM Federal Systems Div., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace; aerospace applications of computers;
computers --- Redundancy; computers, digital ---
General Purpose Application; design; failure coverage;
fault tolerant computing; instrumentation; maximum;
redundancy; redundancy management; redundant avionic
configuration; space; Space Shuttle computers; space
shuttles; total failure coverage; vehicles",
}
@Article{Kidd:1976:PME,
author = "Robert H. {Kidd III} and Robert H. {Wolfe, Jr.}",
title = "Performance Modeling of {Earth} Resources Remote
Sensors",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "29--39",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A technique is presented for constructing a
mathematical model of an Earth resources remote sensor.
The technique combines established models of electronic
and optical components with formulated models of scan
and vibration effects, and it includes a model of the
radiation effects of the Earth's atmosphere. The
resulting composite model is useful for predicting
in-flight sensor performance, and a descriptive set of
performance parameters is derived in terms of the
model. A method is outlined for validating the model
for each sensor of interest. The validation for one
airborne infrared scanning system is accomplished in
part by a satisfactory comparison of predicted response
with laboratory data for that sensor.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B7230C
(Photodetectors); B7710 (Geophysical techniques and
equipment); C3240D (Electric transducers and sensing
devices)",
classification = "443; 641; 723; 732; 741",
corpsource = "IBM Federal Systems Div., Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "airborne infrared scanning system; atmosphere;
atmospheric radiation; Earth resources remote sensor;
Earth's; image processing --- Vibrations; infrared
detectors; infrared imaging; modelling; natural;
performance; radiation effects; remote sensing;
sciences applications of computers; terrestrial
atmosphere",
treatment = "P Practical",
}
@Article{Bernstein:1976:DIP,
author = "Ralph Bernstein",
title = "Digital Image Processing of {Earth} Observation Sensor
Data",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "40--57",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:27:32 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes digital image processing
techniques that were developed to precisely correct
Landsat multispectral Earth observation data and gives
illustrations of the results achieved, e.g., geometric
corrections with an error of less than one picture
element, a relative error of one-fourth picture
element, and no radiometric error effect. Techniques
for enhancing the sensor data, digitally mosaicking
multiple scenes, and extracting information are also
illustrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B7710
(Geophysical techniques and equipment); C7300 (Natural
sciences computing)",
classification = "723; 732; 741; 941",
corpsource = "IBM Federal Systems Div., Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data; data processing; digital image processing;
digital systems; digitally; enhancement; ERTS;
geometric corrections; image processing; information
extraction; infrared imaging; LANDSAT; Landsat
multispectral Earth; mosaicking multiple scenes;
natural; observation data; optical instruments ---
Infrared; picture processing; remote sensing;
satellites --- Television Equipment; sciences
applications of computers",
treatment = "P Practical",
}
@Article{Coon:1976:SAC,
author = "Thomas R. Coon and John E. Irby",
title = "{Skylab} Attitude Control System",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "58--66",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The attitude stabilization and control system for
Skylab evolved from an analog controller into a fully
digital processing system. Features of this system
include a software-determined attitude reference to
provide general maneuvering ability, an in-orbit
programming capability, the use of large control moment
gyros for attitude control, and the use of vehicle
maneuvers to desaturate gyro momentum. The objectives,
requirements, and implementations of the control system
software are described, along with the rationales for
certain design decisions and discussion of some system
dynamics and actual performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3120C (Spatial variables control); C3360L (Aerospace
control); C7420 (Control engineering computing)",
classification = "655; 722; 723; 731; 943",
corpsource = "IBM Federal Systems Div., Huntsville, AL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "attitude control; computers; computers, digital ---
Special Purpose Applications; control; control
engineering applications of; control systems, digital;
digital control; digital processing; gyroscopes;
Skylab; Skylab attitude control system; space vehicles;
system software",
treatment = "P Practical",
}
@Article{Hudson:1976:LST,
author = "Frederick J. Hudson",
title = "{Large Space Telescope}",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "67--74",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Large Space Telescope, which is scheduled to be
put into orbit above the Earth's atmosphere by NASA in
the early 1980s, is a large, multipurpose optical
instrument that is being designed to provide an
increase in observational capability of nearly 100
multiplied by with respect to brightness, 10 multiplied
by in resolving power, and a substantial bandwidth
improvement over ground-based facilities. This paper
describes, from a functional performance viewpoint, the
LST system and, in greater detail, the on-board Data
Management and Pointing Control Systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3360L (Aerospace control); C3380E (Control of
astronomical instruments); C7420 (Control engineering
computing); C7490 (Computing in other engineering
fields)",
classification = "655; 656; 723; 731; 741",
corpsource = "IBM Federal Systems Div., Huntsville, AL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace control; computers; computers --- Aerospace
Applications; control; control engineering applications
of; control systems; data processing; data processing
--- Natural Sciences Applications; functional
performance viewpoint; Large Space Telescope; large
space telescope; onboard data management; physical
instrumentation; pointing control systems; satellites
--- Astronomical; space research --- Surveillance;
space vehicles; telescopes",
treatment = "P Practical",
}
@Article{Byrne:1976:LPS,
author = "Frank Byrne and Gordon V. Doolittle and Robert W.
Hockenberger",
title = "Launch Processing System",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "75--83",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a functional description of the
Launch Processing System, which provides automatic
ground checkout and control of the Space Shuttle launch
site and airborne systems, with emphasis placed on the
Checkout, Control, and Monitor Subsystem. Hardware and
software modular design concepts for the distributed
computer system are reviewed relative to performing
system tests, launch operations control, and status
monitoring during ground operations. The communication
network design, which uses a Common Data Buffer
interface to all computers to allow
computer-to-computer communication, is discussed in
detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9480 (Instrumentation and techniques for aeronomy,
space physics, and cosmic rays); B7650 (Ground support
systems); C3360L (Aerospace control); C7420 (Control
engineering computing); C7490 (Computing in other
engineering fields)",
classification = "655; 716; 722; 723; 731",
corpsource = "John F. Kennedy Space Center, NASA, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace control; airborne systems; automatic;
communication; computer systems programming; computer
to computer communications; computers; computers ---
Aerospace Applications; control; control engineering
applications of; control systems --- Telecontrol; data
processing; data transmission; digital communication
systems; functional description; ground checkout;
ground support systems; launch operations control;
Launch Processing System; modular design concepts;
network design; Space Shuttle launch site; space
shuttles; space vehicles; status monitoring; system
tests",
treatment = "P Practical",
}
@Article{Sohoni:1976:ROA,
author = "Vinay Shridhar Sohoni",
title = "Real-Time Orbiter Abort Guidance",
journal = j-IBM-JRD,
volume = "20",
number = "1",
pages = "84--88",
month = jan,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a real-time abort guidance
algorithm which determines the time sequence of the
powered maneuvers and the orientation of the thrust
vector throughout an abort-mission action initiated
during the orbiter ascent phase. It involves guiding a
heavily loaded Space Shuttle vehicle, passing through
severe environmental conditions, back to a designated
landing area. A graphical example and estimates of the
computer requirements are included.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3360L (Aerospace control); C7420 (Control engineering
computing); C7490 (Computing in other engineering
fields)",
corpsource = "IBM Federal Systems Div., Huntsville, AL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace control; computer programming ---
Subroutines; computers; control engineering
applications of; guidance; orbiter ascent phase; real
time abort; real-time systems; Space Shuttle vehicle;
space shuttles; space vehicles; space vehicles ---
Orbits and Trajectories",
treatment = "P Practical",
}
@Article{Chaudhari:1976:SSB,
author = "P. Chaudhari and S. R. Herd",
title = "Submicrometer Stripes and Bubbles in Amorphous Films",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "102--108",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Lorentz microscopy is used to study amorphous thin
films of Gd-Co-Au and Gd-Co-Mo having a range of Q
values. Stripe and bubble formation are shown as a
function of perpendicular bias fields and pulsed or
rotating in-plane fields. In the presence of an
in-plane field, stripes contain a pair of Bloch lines
and break into rows of Bloch-line containing bubbles. A
unichiral stripe, however, forms a unichiral bubble
that is stable to higher perpendicular bias fields than
are Bloch-line bubbles. Bloch-line rotation in bubble
walls in the presence of external rotating fields is
demonstrated, and Bloch-line motion due to sweeping
in-plane walls is shown. The rare occurrence of four
Bloch lines in a 0.2- $\mu$ m bubble is observed, as is
the pearl-like accumulation of multiple Bloch lines in
walls of irregularly shaped domains.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7550 (Studies of specific magnetic materials); A7560E
(Magnetization curves, hysteresis, Barkhausen and
related effects); A7570K (Domain structure in magnetic
films (magnetic bubbles)); B3110C (Ferromagnetic
materials); B3120L (Magnetic bubble domain devices);
B3120N (Magnetic thin film devices)",
classification = "547; 708; 712; 721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amorphous films; amorphous state; Bloch lines; bubble
formation; bubbles; cobalt alloys; data storage,
magnetic --- Bubbles; films; gadolinium alloys;
gadolinium and alloys --- Microscopic Examination;
Gd-Co-Au; Gd-Co-Mo thin films; Lorentz electron
microscopy; magnetic; magnetic bubbles; magnetic
materials --- Bubbles; magnetic thin films;
perpendicular bias fields; rotating in plane fields;
submicron bubbles; submicron stripes; thin films",
treatment = "X Experimental",
}
@Article{Argyle:1976:BLM,
author = "B. E. Argyle and J. C. Slonczewski and O. Voegeli",
title = "Bubble Lattice Motions Due to Modulated Bias Fields",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "109--122",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper investigates collective bubble motions that
occur in low-damping garnet films by excitation
involving homogeneous or nearly homogeneous fields,
e.g., bias-field modulations. Their gradients, if
significant, are in any case orthogonal to the motion
studied. These various motions belong to a new
phenomenon called bubble automotion because the
self-propulsion results from coupling of the principal
translational degree of freedom of the bubble either
with the internal degrees or with the orthogonal
component of translation. It is observed that periodic
variations of bias field can couple to a close-packed
lattice of magnetic bubbles to produce a steady
rotation of the bubble lattice (RBL). Pulsed fields
excite various other many-body phases as well. The
physical motions of such bubble arrays can be described
by ``lattice melting'', and ``rotating galaxies''. The
RBL phase is stable over wide ranges of pulse width and
amplitude when the film is thick and the lattice is
confined either by a circular ion-milled groove or by
radially symmetric inhomogeneous fields from the
excitation coil itself. Microsecond pulsed fields of
minus 0.05 multiplied by $4 \pi M_s$ applied to a
lattice of five-$\mu$m bubbles produce a net
displacement of up to 1.5 $\mu$ m/pulse at the rim of a
lattice 23 bubbles across and 250 $\mu$m in diameter.
Sinusoidal bias modulation in the range 1 to 30 MHz
produces a spectrum of lattice rotational velocities vs
frequency having both signs. At frequencies near the
low end of the spectrum both the magnitude and the sign
of the rotation are sensitive to drive amplitude. A
tentative theory attributes lattice rotation to
nonlinearities involving the bubble-deflection
effect.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7560E (Magnetization curves, hysteresis, Barkhausen
and related effects); A7570K (Domain structure in
magnetic films (magnetic bubbles)); B3120L (Magnetic
bubble domain devices); B3120N (Magnetic thin film
devices)",
classification = "708; 721",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bubble arrays; bubble lattice; bubble lattice
rotation; bubble lattices; data storage, magnetic ---
Bubbles; garnets --- Thin Films; lattice rotation;
magnetic bubble lattices; magnetic bubbles; magnetic
materials; magnetic thin films; modulated bias fields;
motions",
}
@Article{Chen:1976:SMO,
author = "T. C. Chen and C. Tung",
title = "Storage Management Operations in Linked Uniform
Shift-Register Loops",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "123--131",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new storage structure, called a uniform ladder,
consists of a linear array of equal shift-register
loops, each holding one record and linked by
flow-steering switches. Data exchange across a loop
boundary is mandatory if the controlling switch is on
and forbidden if off. For MRU (Most Recently Used)
storage management, the most important operation is the
climbing of data to the top of the ladder from a depth
of D loops, which takes only (D plus 1)/2 record
periods in the uniform ladder. Program switching is
enhanced by efficient schemes for partial environmental
exchanges and also by internal block transfers. A
pushdown stack can be efficiently implemented by a
change in the record storing technique. The uniform
ladder can probably be implemented in any
shift-register technology, although one given design
uses the magnetic bubble technology. In any case, the
current emphasis on shift registers is for storage
applications, for which the uniform ladder seems very
well suited.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320E (Storage on stationary magnetic media); C6120
(File organisation)",
classification = "721; 722; 723",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computers, digital ---
Shift Registers; data processing --- Data Structures;
data storage, magnetic --- Bubbles; flow; internal
block; linked uniform shift register loops; magnetic
bubble devices; magnetic bubbles; most recently used
storage management; pushdown stack; shift registers;
steering switches; storage management; storage
management operations; storage structure; transfers;
uniform ladder",
treatment = "N New Development; T Theoretical or Mathematical",
}
@Article{Collins:1976:EAC,
author = "T. W. Collins and R. W. Cole",
title = "Effects of Abrupt Changes in Film Thickness on
Magnetic Bubble Forces",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "132--137",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Forces on a magnetic bubble due to abrupt asymmetric
changes in the surface configuration of the magnetic
film are investigated theoretically and experimentally.
A model is derived for calculating the forces on a
bubble as it is being moved by conductor propagation
through a thickness gradient in the film. An experiment
is described in which the forces necessary to move a
bubble through this transition region are measured and
compared with predicted values computed from the model.
Results are presented for a 20 degree gradient with a
cut 0.62 $\mu$ m deep in a garnet film, nominally 3.8
$\mu$ m thick, prepared by liquid phase epitaxy.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7560E (Magnetization curves, hysteresis, Barkhausen
and related effects); A7570K (Domain structure in
magnetic films (magnetic bubbles)); B3120L (Magnetic
bubble domain devices); B3120N (Magnetic thin film
devices)",
classification = "701; 708; 921; 942",
corpsource = "IBM General Products Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abrupt changes in film thickness; conductor
propagation; experimental results; film; film thickness
changes effects; garnets --- Thin Films; magnetic
bubble forces; magnetic bubbles; magnetic field
measurement --- Mathematical Models; magnetic
materials; magnetic thin films; model; thickness
gradient",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Markowsky:1976:BCP,
author = "G. Markowsky and B. K. Rosen",
title = "Bases for Chain-Complete Posets",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "138--147",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "06A10 (68A10)",
MRnumber = "52 \#13523",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper studies a basis concept directly analogous
to the concept of a basis for a vector space. The new
basis concept includes that of H. Egli and R. L.
Constable as a special case, and one of their theorems
is a corollary of the results. The paper also
summarizes some previously reported but little known
results of wide utility. For example, if every linearly
ordered subset (chain) in a poset (partially ordered
set) has a least upper bound (supremum), so does every
directed subset. Given posets P and Q, it is often
useful to construct maps g:P yields Q that are
chain-continuous: supremums of nonempty chains are
preserved. Chain-continuity is analogous to topological
continuity and is generally much more difficult to
verify than isotonicity: the preservation of the order
relation. This paper introduces the concept of an
extension basis: a subset B of P such that any isotone
f:B yields Q has a unique chain-continuous extension
g:P yields Q. Two characterizations of the
chain-complete posets that have extension bases are
obtained. These results are then applied to the problem
of constructing an extension basis for the poset left
bracket P yields Q right bracket of chain-continuous
maps from P to Q, given extension bases for P and Q.
This is not always possible, but it becomes possible
when a mild (and independently motivated) restriction
is imposed on either P or Q. A lattice structure is not
needed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0290 (Other topics in mathematical methods in
physics); B0250 (Combinatorial mathematics); C1160
(Combinatorial mathematics)",
classification = "721; 723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automata theory; basis concept; chain; chain
continuity; complete posets; computer metatheory;
extension basis; isotonicity; nonempty chains;
partially ordered sets; posets; set theory; supremums
of",
reviewer = "Evelyn Nelson",
treatment = "T Theoretical or Mathematical",
}
@Article{Pimbley:1976:DFL,
author = "W. T. Pimbley",
title = "Drop Formation from a Liquid Jet: a Linear
One-Dimensional Analysis Considered as a Boundary Value
Problem",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "148--156",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Using a one-dimensional model, the author studied drop
formation using a boundary value perturbation, rather
than a spatially periodic one as considered by
Rayleigh. The Rayleigh solution becomes the high jet
velocity approximation to this linear analysis. At
lower velocities the analysis shows that the medium
becomes dispersive, and drop formation characteristics
are quite different from that predicted by Rayleigh. In
an appendix, the gross momentum balance and flow rate
conservation are used to consider drop formation from a
stream.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); A4755K (Multiphase
flows)",
classification = "631; 921; 931",
corpsource = "IBM System Communications Div. Lab., Endicott, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boundary; boundary value problem; drop formation;
drops; flow of fluids --- Jets; jets; linear one
dimensional model; liquid jet; liquids; mathematical
techniques --- Boundary Value Problems; value
perturbation",
treatment = "T Theoretical or Mathematical",
}
@Article{Lomet:1976:OVB,
author = "D. B. Lomet",
title = "Objects and Values: the Basis of a Storage Model for
Procedural Languages",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "157--167",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model for storage in procedural languages is
presented. Its fundamental notion is to strictly
distinguish values from storage objects. Several
difficulties in current languages are resolved in this
model, e.g., the problem of flexible locations and the
meaning of the term type. In the light of the storage
object\slash value dichotomy, several notions are found
to be covered by the term type. The implications of the
model are explored with respect to the more
conventional data constructs of procedural languages as
well as to sets and how they might be provided.
Finally, data extension mechanisms are considered.
Whereas the treatment here is not complete, the
template concept introduced in the model does suggest a
useful framework for providing benefits of data
extensibility.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140 (Programming languages)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data extension
mechanisms; data storage, digital; dichotomy;
languages; procedural languages; procedural
programming; programming languages; storage model;
storage object/value; storage objects; storage values",
treatment = "T Theoretical or Mathematical",
}
@Article{Chen:1976:ECC,
author = "C. L. Chen and R. A. Rutledge",
title = "Error Correcting Codes for Satellite Communication
Channels",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "168--175",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A10",
MRnumber = "56 \#5038",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper addresses the problem of efficient forward
error correction on differentially encoded,
quadriphase-shift-keying (DQPSK) channels. This
approach is to design codes to correct the most
probable error patterns. First the probability
distribution of error patterns is derived. Then a class
of convolutional codes that correct any single two-bit
error is described. Finally a threshold decodable code
that corrects all single, and many double, two-bit
errors is presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6250G (Satellite relay systems)",
classification = "655; 723; 731",
corpsource = "IBM System Products Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "codes; codes, symbolic; communication satellites;
computers --- Data Communication Systems;
convolutional; correction; differentially encoded PSK;
digital communication systems; DQPSK; efficient forward
error; error correcting codes; error correction codes;
error probability distribution; information theory ---
Communication Channels; most probable error patterns;
phase; quadriphase shift keying; satellite
communication channels; satellite links; shift keying;
threshold decodable code",
treatment = "T Theoretical or Mathematical",
}
@Article{Meier:1976:EMR,
author = "J. H. Meier and J. W. Raider",
title = "Electric Motor Requirements for Positioning an
Inertial Load",
journal = j-IBM-JRD,
volume = "20",
number = "2",
pages = "176--183",
month = mar,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with the motor, the inertia ratio,
and the power input requirements for moving an inertial
load over a specified distance in a specified time. A
linear speed-torque relationship is assumed, and
selected motor parameters are normalized to the load to
establish generally applicable solutions and
characteristic curves. Emphasis is placed on the
velocity-time diagrams and the relationship among the
inertia ratio, the rated motor power, and the
electrical input power. It is shown that optimization
is possible for input power at stall, input power
immediately following torque reversal, and average
input power. Computer generated curves are presented
for these three cases, and their relationships are
discussed. Finally, it is shown that the motor time
constant has a great influence on power requirements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B8510 (Drives); C3260B (Electric actuators and final
control equipment)",
classification = "705; 731",
corpsource = "IBM System Communications Div. Lab., Endicott, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "at stall; average input power; characteristic curves;
constant; control, mechanical variables --- Position;
drives; electric drives; electric motor; electric
motors; electrical input power; inertia ratio; inertial
load; inertial load positioning; input power; linear
speed torque relationship; motor parameters; motor
time; optimisation; power input requirements;
requirements; specified distance; specified time; time
diagrams; torque reversal; velocity",
treatment = "T Theoretical or Mathematical",
}
@Article{Rissanen:1976:GKI,
author = "J. J. Rissanen",
title = "Generalized {Kraft} inequality and arithmetic coding",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "198--203",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A10",
MRnumber = "54 \#12359",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arithmetic coding; associated entropy; coding speed;
decoding; encoding; finite alphabet; finite strings;
generalised Kraft inequality",
reviewer = "Jack K. Wolf",
treatment = "T Theoretical or Mathematical",
}
@Article{Gustavson:1976:ABL,
author = "F. G. Gustavson",
title = "Analysis of the {Berlekamp--Massey} linear feedback
shift-register synthesis algorithm",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "204--212",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20 (68A20)",
MRnumber = "54 \#4834",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C4230 (Switching theory)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; analysis; Berlekamp Massey algorithm;
binary sequences; encoded length; encoding; length
distribution; linear feedback shift; register
synthesis; shift registers",
reviewer = "E. R. Berlekamp",
treatment = "T Theoretical or Mathematical",
}
@Article{Gustavson:1976:ABM,
author = "F. G. Gustavson",
title = "Analysis of the {Berlekamp--Massey} linear feedback
shift-register synthesis algorithm",
journal = j-IBM-JRD,
volume = "20",
number = "??",
pages = "204--212",
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "351.94021",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lin:1976:DCP,
author = "B. J. Lin",
title = "{Deep-UV} conformable-contact photolithography for
bubble circuits",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "213--221",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120L (Magnetic bubble domain devices); B3120N
(Magnetic thin film devices); B3120 (Magnetic material
applications and devices); C5320E (Storage on
stationary magnetic media)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.1 micron; conformable contact photolithography; deep
UV photolithography; experimental results; fabrication;
features size range 2.5 to; high density bubble memory
circuits; level masking; linewidth; magnetic bubble
device; magnetic bubble devices; mask to wafer gap;
mask to wafer holder; photolithography; single;
tolerance requirements",
treatment = "N New Development; X Experimental",
}
@Article{Barker:1976:LDT,
author = "J. A. Barker and M. L. Klein and M. V. Bobetic",
title = "Lattice dynamics with three-body forces: solid {Xe}
and {Kr}",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "222--227",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4630C (Elasticity); A6220D (Elasticity, elastic
constants); A6320D (Phonon states and bands, normal
modes, and phonon dispersion); A8140J (Elasticity and
anelasticity)",
corpsource = "IBM San Jose Res. Labs., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0K; anharmonic effects; elastic constants; forces;
krypton; lattice phonons; multiparameter pair
potentials; phonon dispersion curves; pV isotherms;
quasiharmonic lattice dynamics; solid Kr; solid Xe;
three body; xenon; zero temperature Debye theta",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Stapper:1976:LYM,
author = "C. H. Stapper",
title = "{LSI} yield modeling and process monitoring",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "228--234",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM System Products Div. Lab., Burlington, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analytical technique; clustering of defects; IC defect
rate; insulator short circuits; integrated circuit
production; large scale integration; leaky; LSI;
monolithic integrated circuits; photolithographic
defects; pilot line data; pn junctions; process
monitoring; random failures; yield modelling",
treatment = "T Theoretical or Mathematical",
}
@Article{Bechtle:1976:DCS,
author = "B. Bechtle and C. Schunemann and G. Skudelny and V.
Zimmermann",
title = "Delayed closed-loop scheme for stepping motor
control",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "235--243",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B8340 (Small and special purpose electric machines);
C1340G (Time-varying control systems); C3120C (Spatial
variables control); C3120E (Velocity, acceleration and
rotation control); C3340H (Control of electric power
systems)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; closed loop systems; delay greater than
step; delayed closed loop scheme; displacement
characteristic; duration; high speed motor; motor
position control; motor speed control; position
control; programmed speed; stability; stepping motor
control; stepping motors; velocity control",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Hall:1976:OSE,
author = "P. A. V. Hall",
title = "Optimization of Single Expressions in a Relational
Data Base System",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "244--257",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper examines optimization within a relational
data base system. It considers the optimization of a
single query defined by an expression of the relational
algebra. The expression is transformed into an
equivalent expression or sequence of expressions that
cost less to evaluate. Alternative transformations, and
combinations of several transformations, are analyzed.
Measurements on an experimental data base showed
improvements, especially in cases where the original
expression would be impracticably slow in its
execution. A small overhead was incurred, which would
be negligible for large data bases.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "UK Sci. Center, Peterlee, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebra; database management systems; experimental
data base; optimisation of single; queries; relational;
relational data base system; single expressions",
owner = "mckenzie",
treatment = "P Practical",
}
@Article{Bruce:1976:DIJ,
author = "C. A. Bruce",
title = "Dependence of ink jet dynamics on fluid
characteristics",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "258--270",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "equations; flow equation; fluid characteristics; fluid
viscosity; ink jet dynamics; ink jet printing; jet
stability; jet velocity; jets; length; polymer
solutions; printers; separation; separation length;
stream stability",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Bajorek:1976:AMM,
author = "C. H. Bajorek and R. J. Kobliska",
title = "Amorphous materials for micrometer and submicrometer
bubble domain technology",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "271--281",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7550G (Ferrimagnetics); A7560E (Magnetization curves,
hysteresis, Barkhausen and related effects); A7570K
(Domain structure in magnetic films (magnetic
bubbles)); B3110 (Magnetic materials); B3120L (Magnetic
bubble domain devices)B3120N (Magnetic thin film
devices); B3120 (Magnetic material applications and
devices); C5320E (Storage on stationary magnetic
media)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "amorphous; bubble devices; characteristics; films;
garnet films; high density magnetic; magnetic; magnetic
bubble devices; magnetic bubble materials; magnetic
bubbles; micron bubble domain technology; Q-values;
review; reviews; RF sputtering; submicrometer bubble
domain technology; ternary amorphous films",
treatment = "B Bibliography; X Experimental",
}
@Article{Nussbaumer:1976:CCF,
author = "H. J. Nussbaumer",
title = "Complex convolutions via {Fermat} number transforms",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "282--284",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "54 \#12394",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290Z (Other numerical methods); B6140 (Signal
processing and detection); C1260 (Information theory);
C4190 (Other numerical methods); C5280 (Other digital
techniques)",
corpsource = "IBM France, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complex digital filter implementation; computing
complex convolutions; digital filters; Fermat number
transforms; transforms",
reviewer = "G. Robert Redinbo",
treatment = "T Theoretical or Mathematical",
}
@Article{Andrews:1976:SPI,
author = "I. M. Andrews and J. A. Leendertz",
title = "Speckle pattern interferometry of vibration modes",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "285--289",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0710 (Mechanical measurement methods and
instruments); A0760L (Optical interferometry); A4240K
(Holographic interferometry; other holographic
techniques); A4630R (Mechanical measurement methods and
techniques for solids); B4350 (Holography)",
corpsource = "IBM Hursley, Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "alignment; electronic speckle pattern methods;
engineering test pieces; frequency tuning; holographic
interferometry; identification; interferometry of
vibration modes; light interferometry; object;
resonance; speckle; three dimensional objects; time
average holography; vibration measurement",
treatment = "X Experimental",
}
@Article{Wiederhold:1976:COS,
author = "Gio Wiederhold",
title = "Comment on: {``Segment synthesis in logical data base
design''} {(IBM J. Res. Develop. {\bf 19} (1975),
71--77) by C. P. Wang and H. H. Wedekind}. With a reply
by the authors",
journal = j-IBM-JRD,
volume = "20",
number = "3",
pages = "290--290",
month = may,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "56 \#1852",
bibdate = "Sat Feb 24 09:27:40 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Wang:1975:SSL} and comment
\cite{Bernstein:1976:CSS}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "binary lexicons; data model; database management
systems; logical data base design; segment synthesis of
data bases",
reviewer = "W. W. Armstrong",
treatment = "T Theoretical or Mathematical",
}
@Article{Heidorn:1976:APT,
author = "G. E. Heidorn",
title = "Automatic Programming Through Natural Language
Dialogue: a Survey",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "302--313",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68-02",
MRnumber = "55 \#1766",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Four research projects are described whose goal is to
develop an automatic programming system that can carry
on a natural language dialogue with a user about his
requirements and then produce an appropriate program.
The NPGS work was completed in 1972, while the work at
ISI, MIT and IBM is current. All are using basically
some form of semantic network representation for their
knowledge base and some form of procedural
specification for their natural language processing.
The three current projects use LISP as the
implementation language but are working on other
languages. Target languages vary. Issues and problems
in the research area are reviewed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6140D (High
level languages)",
classification = "723",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic programming; automatic programming system;
computer metatheory --- Programming Theory; computer
programming; computer programming languages; natural
language dialogue; procedure oriented languages;
programming",
reviewer = "S. Huzino",
treatment = "T Theoretical or Mathematical",
}
@Article{Petrick:1976:NLB,
author = "S. R. Petrick",
title = "On Natural Language Based Computer Systems",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "314--325",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Some of the arguments that have been given both for
and against the use of natural languages in
question-answering and programming systems are
discussed. Several natural language based computer
systems are considered in assessing the current level
of system development. These are the Lunar Sciences
Natural Language Information System (LSNLIS), the
Rapidly Extensible Language (REL), the SHRDLU system
and the Natural Language Processing (NLP) system.
Finally, certain pervasive difficulties that have
arisen in developing natural language based systems are
identified, and the approach taken to overcome them in
the REQUEST (Restricted English QUESTion-Answering)
System is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6140D (High
level languages)",
classification = "723; 901",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; computer programming languages;
computer systems, digital; information retrieval
systems; natural language based computer systems;
procedure oriented languages; programming; REQUEST",
treatment = "P Practical",
}
@Article{Plath:1976:RNL,
author = "W. J. Plath",
title = "{Request}: a Natural Language Question-Answering
System",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "326--335 (or 326--334??)",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "REQUEST is an experimental Restricted English
QUESTion-answering system that can analyze and answer a
variety of English questions, spanning a significant
range of syntactic complexity, with respect to a small
Fortune-500-type data base. REQUEST uses a language
processing approach featuring: (1) the use of
restricted English; (2) a two-phase, compiler-like
organization; and (3) linguistic analysis based on a
transformational grammar. The paper explores the
motivation for this approach in some detail and also
describes the organization, operation, and current
status of the system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C6110 (Systems analysis
and programming); C6140D (High level languages); C6150C
(Compilers, interpreters and other processors)",
classification = "723; 901",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "answering system; computational linguistics; computer
programming languages; computer systems, digital; data
base systems; information retrieval systems; linguistic
analysis; LISP; natural language question; program
processors; REQUEST; restricted English;
transformational grammar; two phase compiler like
organization",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Sowa:1976:CGD,
author = "John F. Sowa",
title = "Conceptual Graphs for a Data Base Interface",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "336--357",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05 (68A50)",
MRnumber = "55 \#13864",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A data base system that supports natural language
queries is not really natural if it requires the user
to know how the data are represented. This paper
defines a formalism, called conceptual graphs, that can
describe data according to the user's view and access
data according to the system's view. In addition, the
graphs can represent functional dependencies in the
data base and support inferences and computations that
are not explicit in the initial query.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C6120 (File
organisation); C6140D (High level languages)",
classification = "723; 921",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computational linguistics; conceptual graphs; data
base interface; data base system; data base systems;
database management systems; mathematical techniques
--- Graph Theory; natural language; procedure oriented
languages; queries",
reviewer = "Allen Klinger",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Dimsdale:1976:BPS,
author = "B. Dimsdale and R. M. Burkley",
title = "Bicubic Patch Surfaces for High-Speed Numerical
Control Processing",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "358--367",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D10",
MRnumber = "55 \#6778",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Parametric bicubic patch surfaces have been used for
some time in manufacture and design. It is convenient
to have such surfaces available as standard numerical
control surfaces using the APT programming language. A
major drawback is that they are costly to use for data
processing of numerical control programs. If, however,
nonparametric bicubics are used, computer time, and
hence cost, can be reduced dramatically. This paper
details a strategy and algorithms for this purpose.
Experimental data suggest that computer costs are
comparable to, or somewhat lower than, the costs for
processing tabulated cylinder surfaces.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7420 (Control engineering computing)",
classification = "723; 913; 922; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APT programming language; bicubic patch processes;
computer costs; data processing --- Manufacturing
Applications; high speed; mathematical techniques ---
Numerical Methods; numerical control; numerical control
processing; processing; surfaces",
reviewer = "Immo O. Kerner",
}
@Article{Calhoun:1976:CAB,
author = "B. A. Calhoun and J. S. Eggenberger and L. L. Rosier
and L. F. Shew",
title = "Column Access of a Bubble Lattice: Column Translation
and Lattice Translation",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "368--375",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a column-accessed bubble lattice device, accessing
is accomplished by first translating the lattice to
position the desired column of bubbles in an
input-output access channel and then translating this
column along the channel to a detector area outside of
the lattice while simultaneously introducing new
bubbles from a generator area at the other end of the
channel. An analysis of the influence of device design
parameters on access rate indicates that the most
important parameters are the column translation rate
and lattice capacity. A device is described that was
designed to study the translation of a lattice of
bubbles and of a single column of bubbles within the
lattice. Quasistatic operating margins and dynamic
measurements indicate that the column-access
configuration provides feasible means for the rapid
access of bubbles from a lattice.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "722",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bubble lattices; data storage, magnetic",
}
@Article{Heath:1976:DSA,
author = "J. S. Heath",
title = "Design of a Swinging Arm Actuator for a Disk File",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "389--397",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An integral disk enclosure that incorporates a novel
head-positioning actuator concept is used in the IBM
System\slash 32 and in terminal controllers, such as
the Retail Store Controller and the Communication
Controller. The actuator is based on a swinging arm
rather than the conventional linear carriage. The
geometrical, structural, and electromechanical bases of
the design are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "704; 722; 732",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "actuators --- Applications; data storage, magnetic",
}
@Article{Raabe:1976:FBC,
author = "H. P. Raabe",
title = "Fast Beamforming with Circular Receiving Arrays",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "398--408",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Fast Fourier Transform (FFT) can be applied to
circular arrays receiving wideband sonar radiation. As
with conventional beamforming, the FFT serves in the
first stage to divide the spectrum into narrow
frequency bands. Then the array element responses of
each band are analyzed in a second stage of FFTs for
the Fourier components (modes) of the array excitation
function for the respective band. Application of
weights of the mode responses, to simulate the
radiation efficiency of the modes for any given element
radiation pattern and to control the array pattern,
yields the Fourier components of the beam pattern.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4330 (Underwater sound); B0290Z (Other numerical
methods); B5270D (Antenna arrays); C4190 (Other
numerical methods); C7410F (Communications computing)",
classification = "716; 752; 921",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "antenna arrays; antenna radiation patterns; antennas;
applications of computers; array; beamforming; circular
receiving arrays; communications; digital simulation;
element radiation pattern; excitation function; fast;
fast Fourier; fast Fourier transforms; mathematical
transformations --- Fast Fourier Transforms; receiving
antennas; sonar; transforms; wideband sonar radiation",
treatment = "T Theoretical or Mathematical",
}
@Article{Onton:1976:SMA,
author = "A. Onton and N. Heiman and J. C. Suits and W.
Parrish",
title = "Structure and Magnetic Anisotropy of Amorphous {Gd-Co}
Films",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "409--411",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is found that the structure of amorphous Gd-Co
films, as revealed by x-ray diffraction, is correlated
with the magnitude of bias voltage present during the
sputter deposition. Films sputter deposited with zero
bias voltage typically show one broad peak in an x-ray
diffraction spectrum, and films sputter deposited with
minus 100 volts bias show two broad peaks with a
shoulder between them. These structural differences
appear to be related to the perpendicular magnetic
anisotropy in these films.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A6860 (Physical properties of thin films,
nonelectronic); A7530G (Magnetic anisotropy); A7550
(Studies of specific magnetic materials); A7570
(Magnetic films and multilayers); B3110C (Ferromagnetic
materials)",
classification = "801; 804; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amorphous Gd-Co films; bias voltage; cobalt alloys;
diffraction; films; gadolinium alloys; gadolinium
compounds --- Anisotropy; magnetic anisotropy; magnetic
thin films; noncrystalline state structure; sputter
deposition; sputtering; structure; X-ray; x-ray
analysis --- Applications; X-ray diffraction
examination of materials",
treatment = "X Experimental",
}
@Article{Bernstein:1976:CSS,
author = "Philip A. Bernstein",
title = "Comment on: {``Segment synthesis in logical data base
design''} {(IBM J. Res. Develop. {\bf 19} (1975),
71--77) by C. P. Wang and H. H. Wedekind}. With a reply
by the authors",
journal = j-IBM-JRD,
volume = "20",
number = "4",
pages = "412--412",
month = jul,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "56 \#1853",
bibdate = "Sat Feb 24 09:28:36 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Wang:1975:SSL} and comment
\cite{Wiederhold:1976:COS}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
corpsource = "Dept. of Computer Sci., Univ. of Toronto, Toronto,
Ont., Canada",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "file organisation; logical data base design; segment
synthesis",
reviewer = "W. W. Armstrong",
treatment = "T Theoretical or Mathematical",
}
@Article{Inselberg:1976:CSI,
author = "A. Inselberg",
title = "Cubic Splines with Infinite Derivatives at Some
Knots",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "430--436",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D05",
MRnumber = "54 \#9039",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A generalization of cubic spline interpolation with
vertical slopes at some knots is proposed. An existence
theorem including an algorithm for constructing such
generalized splines is proved. The resulting splines
are obtained in closed form and they are partition
invariant.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4130 (Interpolation and function approximation)",
classification = "408; 931",
corpsource = "IBM Data Processing Div. Sci. Center, Los Angeles, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; cubic spline interpolation; existence
theorem; generalized splines; invariant splines; knots;
partition; splines (mathematics); structural design ---
Computer Applications; surfaces; vertical slopes",
reviewer = "Claude Carasso",
treatment = "T Theoretical or Mathematical",
}
@Article{Lavenberg:1976:SMP,
author = "S. S. Lavenberg and G. S. Shedler",
title = "Stochastic Modeling of Processor Scheduling with
Application to Data Base Management Systems",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "437--448",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B35 (68A99)",
MRnumber = "54 \#2178",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The processing services rendered in searching the data
base in a DBS and retrieving and processing information
are modeled explicitly, as is the algorithm used to
schedule these services on the processor. The
scheduling of the processor is based on a total
priority ordering of a set of queues for processing
service. A queuing model incorporating the processor
scheduling algorithm for IMS (Information Management
System) is formulated in order to illustrate the
modeling ideas. The model is not used in a performance
study of IMS. The model is illustrative of stochastic
models which can be constructed to incorporate
algorithms for processor scheduling.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140C (Queueing theory); C6120 (File organisation);
C6150J (Operating systems)",
classification = "723; 921; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; cumulative processes; data base management
systems; data base systems; database management
systems; information retrieval systems --- Scheduling;
mathematical models; modelling; probability ---
Queueing Theory; processing services; processor
scheduling; queueing model; queueing theory;
scheduling; stochastic modelling; stochastic processes;
total priority ordering",
reviewer = "Erol Gelenbe",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Gaver:1976:EAA,
author = "D. P. Gaver and S. S. Lavenberg and T. G. {Price,
Jr.}",
title = "Exploratory Analysis of Access Path Length Data for a
Data Base Management System",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "449--464",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "IMS (Information Management System) when the
collection of data analyzed is a sequence of access
path lengths for a day-long period. The number of
segments accessed by searching a data base in order to
retrieve a specified segment for a user is called an
access path length. Part of the motivation for the
analysis is to suggest reasonable stochastic models for
the access path length sequence that can be
conveniently utilized as input models for a stimulation
model of an IMS installation. The exploratory approach
taken to the data involves the use of graphical
displays and simple numerical summaries to reveal
characteristics of, and patterns in, the data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C7100 (Business and
administration)",
classification = "723; 922",
corpsource = "Naval Postgraduate School, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access path length; data base management system; data
base systems; data processing --- Critical Path
Analysis; data structure; data structures; database
management systems; exploratory analysis; graphical
displays; information retrieval systems ---
Mathematical Models; input; model; models; numerical
summaries; probability --- Random Processes;
stochastic",
treatment = "T Theoretical or Mathematical",
}
@Article{Lewis:1976:SAN,
author = "P. A. W. Lewis and G. S. Shedler",
title = "Statistical Analysis of Non-Stationary Series of
Events in a Data Base System",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "465--482",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "56 \#1662",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes methods, both old and new, for
the statistical analysis of non-stationary univariate
stochastic point processes and sequences of positive
random variables. Such processes are frequently
encountered in computer systems. As an illustration of
the methodology an analysis is given of the stochastic
point process of transactions initiated in a running
data base system. On the basis of the statistical
analysis, a non-homogeneous Poisson process model for
the transaction initiation process is postulated for
periods of high system activity and found to be an
adequate characterization of the data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140Z (Other topics in statistics); C6120 (File
organisation); C6150G (Diagnostic, testing, debugging
and evaluating systems)",
classification = "723; 922",
corpsource = "Naval Postgraduate School, Monterey, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; clustering; data base subsystem models; data
base systems; database management systems; methodology;
nonstationary series; performance evaluation;
probability --- Random Processes; process; program
testing; statistical; statistical analysis; stochastic
processes; transaction initiation; workload",
reviewer = "E. C. Posner",
treatment = "T Theoretical or Mathematical",
}
@Article{Lum:1976:GMD,
author = "V. Y. Lum and N. C. Shu and B. C. Housel",
title = "A General Methodology for Data Conversion and
Restructuring",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "483--497",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "While the use of data base systems relieves users of
the task of having to know much of the implementation
details, it has at the same time made data conversion a
necessity for various reasons. The model for data
conversion presented assumes that both source and
target systems are available and that conversion
interfaces may be required to interact between these
systems and the conversion system. To achieve data
conversion or translation using this approach, two
languages are needed: a language to describe the data
structures, and a language to specify the mapping
between source and target data. This paper describes
these two languages, DEFINE and CONVERT and gives
numerous examples to show how they can be used in data
conversion and restructuring.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
annote = "Translated by changing to a `Linear' format. Worked on
the correspondence of this to relational format. Two
languages, one defines the Schema, the other converts
between schemas that have these descriptions
attached.",
classcodes = "C6120 (File organisation); C6140E (Other programming
languages)",
classification = "723",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data; data base
systems; data checking; data conversion; data
description; data processing --- Data Structures; data
restructuring; data structures; languages; mapping;
methodology; model; programming languages; structures",
owner = "curtis",
treatment = "T Theoretical or Mathematical",
}
@Article{Nussbaumer:1976:DFU,
author = "H. J. Nussbaumer",
title = "Digital Filtering Using Complex {Mersenne}
Transforms",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "498--504",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94-04",
MRnumber = "54 \#7091",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Complex Mersenne Transforms are defined in a ring of
integers modulo a Mersenne or pseudo-Mersenne number
and can be computed without multiplications. It is
shown that under certain conditions, these transforms
can be computed by means of fast transform algorithms
and permit the evaluation of digital convolutions with
better efficiency and accuracy than does the Fast
Fourier Transform.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0230 (Integral transforms); B0290Z (Other numerical
methods)B1270F (Digital filters); C1130 (Integral
transforms)C5240 (Digital filters)",
classification = "713; 716; 921",
corpsource = "IBM Centre d'Etudes et Recherches, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accuracy; Complex Mersenne Transforms; digital
convolutions; digital filters; efficiency; electric
filters, digital; fast transform algorithms;
mathematical transformations; signal processing ---
Digital Techniques; transforms",
reviewer = "Bradley W. Dickinson",
treatment = "T Theoretical or Mathematical",
}
@Article{Shedler:1976:DMR,
author = "G. S. Shedler and D. R. Slutz",
title = "Derivation of Miss Ratios for Merged Access Streams",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "505--517",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A99",
MRnumber = "57 \#8234",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An access stream is the sequence of storage accesses
made by an executing program; a merged stream results
from the multiprogramming of a number of individual
access streams. Assuming that LRU (least recently used)
miss ratio functions for individual streams are known,
the authors consider the problem of predicting the LRU
miss ratio function for merged streams. Each access
stream is modeled as a sequence of independent,
identically distributed LRU stack distances which
evolves in time as a Poisson process and the merged
stream is taken to be the superposition of these
processes. For an arbitrary number of such streams, a
closed form expression for the expected miss ratio
function is obtained.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723; 922",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming --- Multiprogramming;
data storage, digital; functions; LRU stack distances;
merged access streams; merging; miss ratio;
multiprogramming; Poisson process; probability ---
Random Processes; storage allocation",
treatment = "T Theoretical or Mathematical",
}
@Article{Tuel:1976:ABP,
author = "W. G. {Tuel, Jr.}",
title = "An analysis of buffer paging in virtual storage
systems",
journal = j-IBM-JRD,
volume = "20",
number = "5",
pages = "518--520",
month = sep,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The model for buffer paging in a virtual storage
system presented in this brief paper explains the
observed sudden increase in paging activity and elapsed
time for a query when the specified buffer size exceeds
the number of page frames available. Analysis of the
model indicates that the total I/O activity increases
with increasing buffer size if the buffer is allowed to
page. Thus, optimum performance is achieved by reducing
the buffer size to fit the number of page frames
available. This is the strategy presently used for
IMS\slash 360 running under OS\slash VS.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "buffer paging; buffers; data base systems; data
storage, digital; exceptions; model; page; searching;
virtual storage; virtual storage systems",
treatment = "T Theoretical or Mathematical",
}
@Article{Horton:1976:WFD,
author = "John W. Horton",
title = "{Walsh} Functions for Digital Impedance Relaying of
Power Lines",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "530--541",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Impedance distance relaying for fault-protection of a
plurality of high-voltage lines has not been
accomplished with a minicomputer because of the burden
of time placed upon these computers. A new method for
computing impedance from data samples is proposed,
which would employ only the computer operations of Add,
Subtract, and Shift. This is valuable because these
operations are one to two orders of magnitude faster on
present day minicomputers than the operations of
Multiply, Divide, Square, and Square Root. The new
method is based upon the use of Walsh functions. When
compared with the best competitive method, this new
method shows superiority in speed and an accuracy that
meets proposed objectives.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B8130B (Power cables); B8140 (Power system
protection); C7410B (Power engineering computing)",
classification = "706; 722; 723; 731; 942",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers, digital --- Special Purpose Application;
control systems, digital; data samples; digital
relaying; electric impedance; electric measurements ---
Impedance; electric power systems --- Protection;
electrical engineering computing; fault; HV lines;
impedance computation; location; minicomputers; power
cables; power lines; protective relaying; relay
protection; Walsh functions",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Schweitzer:1976:BOS,
author = "Paul J. Schweitzer and Simon S. Lam",
title = "Buffer Overflow in a Store-And-Forward Network Node",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "542--550",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20 (60K30 68A99)",
MRnumber = "58 \#33577",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "367.60105",
abstract = "Equilibrium behavior of a store-and-forward network
node with finite buffer capacity is studied via a
network-of-queues model. The positive acknowledgment
protocol is explicitly modeled and consumes part of the
buffer pool. The principal results are the buffer
overflow probability, the mean delays, and the
distribution of queue lengths as functions of the
buffer capacity and traffic levels.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)B6210L (Computer communications); C1140C
(Queueing theory); C5620 (Computer networks and
techniques)",
classification = "716; 718; 723; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "buffer; buffer capacity; buffer overflow probability;
computer networks; data communication systems; data
transmission; mean delays; overflow; packet switching;
probability --- Queueing Theory; queue lengths
distribution; queueing; queueing analysis; store and
forward network node; switching theory;
telecommunication traffic; theory; traffic levels",
treatment = "T Theoretical or Mathematical",
}
@Article{Fernandez:1976:SGT,
author = "Eduardo B. Fern{\'a}ndez and Tomas Lang",
title = "Scheduling as a Graph Transformation",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "551--559",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B35",
MRnumber = "58 \#20378",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "359.68039",
abstract = "The scheduling of a set of tasks, with precedence
constraints and known execution times, into a set of
identical processors is considered. Optimal scheduling
of these tasks implies utilizing a minimum number of
processors to satisfy a deadline, or finishing in
minimal time using a fixed number of processors. This
process can be seen as a transformation of the original
graph into another graph, whose precedences do not
violate the optimality constraints and has a unique
basic schedule. Analysis of this transformation
provides insight into the scheduling process and also
into the determination of lower bounds on the number of
processors and on time for optimal schedules.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B0250
(Combinatorial mathematics); C1160 (Combinatorial
mathematics); C1290 (Applications of systems theory)",
classification = "722; 723; 913; 921",
corpsource = "Data Processing Div., IBM Sci. Center, Los Angeles,
CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems, digital; data processing ---
Optimization; graph theory; graph transformation;
identical processors; lower bounds; mathematical
techniques --- Graph Theory; precedence constraints;
scheduling; scheduling --- Mathematical Models; system
engineering",
treatment = "T Theoretical or Mathematical",
}
@Article{Chamberlin:1976:SUA,
author = "Donald D. Chamberlin and Morton M. Astrahan and Kapali
P. Eswaran and Patricia Priest Griffiths and Raymond A.
Lorie and James W. Mehl and Phyllis Reisner and
Bradford Warren Wade",
title = "{SEQUEL 2}: a Unified Approach to Data Definition,
Manipulation, and Control",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "560--575 (or 560--565??)",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/sqlbooks.bib",
abstract = "SEQUEL 2 is a relational data language that provides a
consistent, English keyword-oriented set of facilities
for query, data definition, data manipulation, and data
control. SEQUEL 2 may be used either as a stand-alone
interface for nonspecialists in data processing or as a
data sublanguage embedded in a host programming
language for use by application programmers and data
base administrators. This paper describes SEQUEL 2 and
the means by which it is coupled to a host language.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6140D (High level
languages); C7100 (Business and administration)",
classification = "723",
corpsource = "IBM Res. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data base systems;
data control; data definition; data processing; data
processing --- Data Handling; data sublanguage;
database management systems; host programming language;
language; manipulation; problem oriented languages;
relational data; sequel 2; SEQUEL 2",
treatment = "G General Review; P Practical",
}
@Article{Wong:1976:DOM,
author = "Chak-Kuen Wong and Po Cheung Yue",
title = "Data Organization in Magnetic Bubble Lattice Files",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "576--581",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Some aspects of data organization in bubble lattice
files (BLF) are discussed. A self-organizing feature
based on Transposition Ordering is introduced to suit
the special requirements of BLF. This scheme can also
be implemented in T-I bar bubble memories without much
difficulty. Many variations of Transposition Ordering
are possible. For example, instead of interchanging
whole columns, only portions of columns can be
interchanged. On the other hand, columns can be
interchanged at a fixed distance as well as adjacent
columns. In this way, one could approximate the
ordering by usage frequency much more quickly through a
compromise between Transposition Ordering and Last Use
Ordering. Some performance figures are included for
comparison.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120L (Magnetic bubble domain devices); C5320E
(Storage on stationary magnetic media); C6120 (File
organisation)",
classification = "721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data organization; data processing --- Data Handling;
data storage, digital --- Self Organizing; data
storage, magnetic; dynamic; file organisation; magnetic
bubble devices; magnetic bubble lattice files; magnetic
film; magnetic memory; magnetic thin film devices;
ordering scheme; performance figures; stores",
treatment = "P Practical",
}
@Article{Grossman:1976:PRT,
author = "David D. Grossman",
title = "Procedural Representation of Three-Dimensional
Objects",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "582--589",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A system of PL/I procedures has been written that
permits geometric objects to be described
hierarchically. The objects are themselves represented
as PL/I procedures, allowing very general use of
variables. By effectively intercepting subprogram
calls, the system provides a means of modifying the
semantics associated with any object without modifying
the object's procedural description.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques)",
classification = "723; 901",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer graphics; computer programming; computer
programming languages --- pl/i; engineering ---
Computer Aided Design; geometric objects; modelling;
objects representation; PL/I procedures; three
dimensional",
treatment = "T Theoretical or Mathematical",
}
@Article{Appel:1976:DTD,
author = "Arthur Appel and Peter M. Will",
title = "Determining the Three-Dimensional Convex Hull of a
Polyhedron",
journal = j-IBM-JRD,
volume = "20",
number = "6",
pages = "590--601",
month = nov,
year = "1976",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method is presented for determining the
three-dimensional convex hull of a real object that is
approximated in computer storage by a polyhedron.
Essentially, this technique tests all point pairs of
the polyhedron for convex edges of the convex hull and
then assembles the edges into the polygonal boundaries
of each of the faces of the convex hull. Various
techniques for optimizing this process are discussed. A
computer program has been written, and typical output
shapes are illustrated. Finding the three-dimensional
convex hull is approximately the same computer burden
as eliminating hidden lines.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques)",
classification = "723; 901",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer graphics; computer program; computer storage;
dimensional convex hull; engineering --- Computer Aided
Design; image processing; pattern recognition systems
--- Optimization; polyhedron; three",
treatment = "T Theoretical or Mathematical",
}
@Article{Buehner:1977:AIJ,
author = "W. L. Buehner and J. D. Hill and T. H. Williams and J.
W. Woods",
title = "Application of Ink Jet Technology to a Word Processing
Output Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "2--9",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a word processing system output
printer that uses the electrostatic synchronous ink jet
printing process. An overview of the ink jet matrix
printing process is provided, as well as brief
descriptions of the elements of the printer. Printer
performance objectives are outlined, and some of the
design problems encountered during development are
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices); B8660 (Power
applications in printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "631; 722; 745; 804",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment --- Printers; design;
development; electrostatic devices; electrostatic
synchronous; flow of fluids --- Jets; ink; ink jet
printing; ink jet printing process; ink jets;
performance; printers; printing; text editing; word
processing output printer",
treatment = "A Application",
}
@Article{Curry:1977:SMI,
author = "S. A. Curry and H. Portig",
title = "Scale Model of an Ink Jet",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "10--20",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A scale model, approximately fifty times the size of
its prototype, was used to study drop formation of an
ink jet. Viscosity, surface tension, and inertial
forces were modeled; gravity and air drag forces were
not. The model accurately predicted operating
conditions leading to the formation of undesirable
satellite drops, thus permitting evaluation of measures
designed to avoid them.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "631; 722; 745; 804; 931",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment --- Printers; drop
formation; drops; flow of fluids --- Jets; inertial
forces; ink; ink jet; ink jets; jets; liquids --- Drop
Formation; operating conditions; printers; printing;
satellite drops; scale model; surface tension",
treatment = "T Theoretical or Mathematical",
}
@Article{Pimbley:1977:SDF,
author = "W. T. Pimbley and H. C. Lee",
title = "Satellite Droplet Formation in a Liquid Jet",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "21--30",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The formation and behavior of satellite droplets in a
liquid jet is investigated experimentally and
theoretically. The satellite droplet break-off distance
is measured stroboscopically as a function of the
frequency and amplitude of nozzle vibration. A
second-order analysis of spatial instability is
developed, which demonstrates the essential features of
satellite formation as it is observed. Satellite
formation is least likely to occur when the main-drop
spacing is five to seven times the jet diameter.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM System Communications Div. Lab., Endicott, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "breakoff distance; droplet formation; drops; flow
instability; flow of fluids --- Jets; ink; ink jets;
jets; liquid jet; liquids; nozzle; printers; printing
--- Electrostatic; satellite droplets; spatial
instability; vibration",
treatment = "P Practical",
}
@Article{Twardeck:1977:EPV,
author = "T. G. Twardeck",
title = "Effect of Parameter Variations on Drop Placement in an
Electrostatic Ink Jet Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "31--36",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses the sensitivity of drop-to-drop
spacing in the print plane of an ink jet printer to
other printer variables. Two designed experiments, a
fractional factorial and a central composite, combined
with standard analysis identified the critical
variables and provided a mathematical expression useful
for setting tolerances.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices); B8660 (Power
applications in printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "631; 745; 804; 921; 931",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; critical variables; drop placement; drops;
electrostatic devices; electrostatic ink jet printer;
flow of fluids --- Jets; ink; ink jets; jets; liquids
--- Drop Formation; mathematical techniques; printers;
printing; sensitivity; spacing; tolerances",
treatment = "T Theoretical or Mathematical",
}
@Article{Fillmore:1977:DCD,
author = "G. L. Fillmore and W. L. Buehner and D. L. West",
title = "Drop Charging and Deflection in an Electrostatic Ink
Jet Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "37--47",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Included in this discussion of drop charging are
induction interaction effects and charge
synchronization requirements, as well as design
considerations for the charge electrode. In describing
the parameters governing drop deflection, some drop
placement errors are related to undesired interactions
resulting from aerodynamic forces and electrostatic
repulsion effects on the drops. A scheme for obtaining
accurate drop placement in the presence of these
interaction effects is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices); B8660 (Power
applications in printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "631; 745; 804; 931",
corpsource = "IBM Office Products Div. Lab., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerodynamic forces; charge electrode; charge
synchronization; design; drop charging; drop
deflection; drop placement errors; drops; effects;
electrostatic devices; electrostatic ink jet printer;
electrostatic repulsion; flow of fluids --- Jets; ink;
ink jets; interaction; jets; liquids --- Drop
Formation; printers; printing",
treatment = "P Practical",
}
@Article{Lee:1977:BLA,
author = "H. C. Lee",
title = "Boundary Layer Around a Liquid Jet",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "48--51",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The phenomenon of air wake caused by a train of liquid
drops is studied by approximating the train to a
cylindrical jet emerging from a nozzle. The boundary
layer equations are derived by applying continuity of
jet mass and matching the loss of jet momentum with the
air drag on the jet. These equations are solved
numerically and compared with experiments in which the
velocity change of the jet along the stream is
carefully measured through measurements of drop
distances. Good agreement is obtained between
experimental results and the analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4715C (Laminar boundary layers); A4755C (Jets in
fluid dynamics); C5550 (Printers, plotters and other
hard-copy output devices)",
classification = "631; 651; 931",
corpsource = "IBM System Communication Div. Lab., Endicott, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerodynamics --- Wakes; air drag; air wake; boundary
layer; boundary layers; cylindrical job; drop
distances; equations; flow of fluids; jets; liquid
drops; liquids --- Drop Formation; printers; wakes",
treatment = "T Theoretical or Mathematical",
}
@Article{Carmichael:1977:CPH,
author = "J. M. Carmichael",
title = "Controlling Print Height in an Ink Jet Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "52--55",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A control system is described for maintaining constant
print height in an ink jet printer. Following power on
and during a periodic off-line correction operation a
specially designed sensor detects the position of a
test group of electrostatically charged ink drops to
obtain print height correction data. Information
provided by the same sensor is used to synchronize the
application of a unique charge to each drop to be
printed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices); B8660 (Power
applications in printing industries); C3120C (Spatial
variables control); C3350L (Control applications in
printing and associated industries); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "631; 745; 804",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "constant print height; electrostatic devices;
electrostatically charged ink drops; flow of fluids ---
Jets; ink; ink jet printer; ink jets; jets; position
control; print height correction; printers; printing;
sensor",
treatment = "A Application; P Practical",
}
@Article{Levanoni:1977:SFF,
author = "M. Levanoni",
title = "Study of Fluid Flow Through Scaled-Up Ink Jet
Nozzles",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "56--68",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A 100-fold scaled-up model of ink jet nozzle flow is
described. A theoretical justification for scaling the
relevant parameters, starting from the equations of
motion, is presented. The scaling procedure and the
effects of unscaled parameters are discussed as well as
the scaled-up ``ink''. Following a description of the
experimental apparatus, the results of a series of
experiments are then presented. These consist of
directionality, directional stability and flow
efficiency measurements in four nozzle configurations:
conical, cylindrical, square, and ``hybrid'' nozzles.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); A4755E (Nozzles);
C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "631; 745; 804",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "conical nozzles; cylindrical nozzles; directional
stability; directionality; equation of motion; flow
efficiency; flow instability; flow of fluids; hybrid;
ink; ink jet nozzle flow; ink jets; jets; nozzles;
printers; printing --- Electrostatic; scaling; square
nozzles",
treatment = "T Theoretical or Mathematical",
}
@Article{Ashley:1977:DCI,
author = "C. T. Ashley and K. E. Edds and D. L. Elbert",
title = "Development and Characterization of Ink for an
Electrostatic Ink Jet Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "69--74",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The formulation logic, test procedures, failure
analyses and problem resolutions involved in developing
ink for an electrostatic ink jet printer are reviewed.
The variables that influence the jet printing process
and print quality are defined, and their relationship
to specific formulations is discussed. Also considered
are the relationships between formulation variables and
failure modes inherent in the ink.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0590 (Materials testing); B5180D (Electrostatic
devices); B8660 (Power applications in printing
industries); C5550 (Printers, plotters and other
hard-copy output devices)",
classification = "631; 745; 804",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electrostatic devices; electrostatic ink jet printer;
failure analyses; failure analysis; flow of fluids ---
Jets; formulation logic; ink; ink characterisation; ink
development; ink jets; jet printing process; materials
testing; print; printers; printing --- Electrostatic;
procedures; quality; test",
treatment = "P Practical",
xxtitle = "Development and characterisation of ink for an
electrostatic ink jet printer",
}
@Article{Beach:1977:MSI,
author = "B. L. Beach and C. W. Hildenbrandt and W. H. Reed",
title = "Materials Selection for an Ink Jet Printer",
journal = j-IBM-JRD,
volume = "21",
number = "1",
pages = "75--80",
month = jan,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An ink jet printer includes a system of parts that
supplies, filters, pumps, circulates, and pulses a jet
of ink. These parts, made of various materials (metals,
plastics, rubbers, adhesives), must satisfy the
mechanical and electrical requirements of the system
while being compatible with the chemical composition of
the ink. This paper describes the selection and
evaluation of these materials for a particular ink and
printer design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0590 (Materials testing); B8660 (Power applications
in printing industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "745",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chemical composition; electrical requirements; ink jet
printer; ink jets; materials; materials testing;
mechanical requirements; parts; printers; printing ---
Electrostatic; printing machinery; selection",
treatment = "P Practical",
}
@Article{Street:1977:PPS,
author = "G. Bryan Street and Richard L. Greene",
title = "Preparation and Properties of ({SN})$_x$",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "99--110",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The chain compound (SN)$_x$ is the first example of a
superconducting polymer. A review is given of the
chemistry, structure, and physical properties of
(SN)$_x$ and describing how the electrical properties
of this novel material depend upon the crystal growth
technique. The thermal properties of S$_2$N$_2$ and
(SN)$_x$ are discussed with particular reference to the
crystal growth process. The fibrous nature of the
polymer is described and evidence is presented showing
that interchain coupling plays a significant role in
determining the physical properties of this material.
Finally the authors summarize their attempts to prepare
analogous polymeric metals.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7470 (Superconducting materials); A8110B (Crystal
growth from vapour); B0510 (Crystal growth); B3220
(Superconducting materials)",
classification = "708; 815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(SN)/sub x/; analogous polymeric metals; chain
compound; chemistry; crystal growth from vapour;
crystal growth technique; electrical; interchain
coupling; one-dimensional conductivity; physical
properties; polymers; properties; reviews; structure;
sulphur compounds; superconducting materials;
superconducting polymer; thermal properties; type II
superconductors",
treatment = "B Bibliography; G General Review",
}
@Article{Lyerla:1977:NSC,
author = "James R. {Lyerla, Jr.}",
title = "{NMR} Study of the Chain Microstructure of
p({MMA-Co-MAA})",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "111--120",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The usefulness of proton and carbon-13 NMR
spectroscopy in characterizing the chain microstructure
(i.e., sequence distribution and tacticity) of methyl
methacrylate-methacrylic acid (MMA-MAA) copolymers is
investigated. Because the comonomers have such similar
structures, assessment of chain tacticity and sequence
distribution required computer simulation of spectra to
circumvent the problems of resonance overlap. The
results indicate that free-radical polymerization in
toluene yielded a heterogeneous copolymer system while
free-radical polymerization in tetrahydrofuran (THF)
and emulsion polymerization yielded relatively
homogeneous systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "copolymers",
}
@Article{Hiraoka:1977:RCP,
author = "Hiroyuki Hiraoka",
title = "Radiation Chemistry of Poly(Methacrylates)",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "121--130",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An experimental study comparing radiation-induced
degradation of poly(methacrylates) from ultraviolet,
gamma-ray (**6**0Co), and electron-beam irradiation is
presented. Analytical techniques used include mass
spectroscopy, low-temperature electron paramagnetic
resonance, and infrared spectrometry. The
poly(methacrylate) polymers investigated are
poly(methyl methacrylate) (PMMA), poly(t-butyl
methacrylate) (PBMA), poly(methacrylic acid) (PMA), and
poly(methacrylic anhydride) (PMA AN). All are shown to
exhibit scission of the main chains and removal of the
side groups when irradiated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A6180E (Gamma ray effects); A6180F (Electron
and positron effects); A8250 (Photochemistry and
radiation chemistry); B0560 (Polymers and plastics
(engineering materials science))B2550 (Semiconductor
device technology); B2550G (Lithography)",
classification = "622; 815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "beam effects; chains scission; degradation; effects;
electron; electron beam effects; electron paramagnetic
resonance; electron resists; gamma ray effects;
gamma-ray effects; infrared spectrometry; main; mass
spectroscopy; photoresists; poly(methacrylates);
poly(methacrylic acid); poly(methacrylic anhydride);
poly(methyl methacrylate); poly(t-butyl methacrylate);
polymers; radiation; radiation chemistry; ultraviolet
radiation",
treatment = "X Experimental",
}
@Article{Tu:1977:MKP,
author = "Yih-O Tu and Augustus C. Ouano",
title = "Model for the Kinematics of Polymer Dissolution",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "131--142",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The dissolution of glassy polymers is described by a
phenomenological model of the motion of two boundaries:
the liquid-gel boundary and the gel-glass boundary. The
motion of these boundaries, as well as the
concentration profile in the layers of a dissolving
polymer, was obtained by numerical solution of the
Stefan boundary value problem. A potential application
of this model to the study of the dissolution dynamics
of other polymer-solvent systems is done by simulating
the dissolution of three types of polymer-solvent
pairs: (1) swelling of rubber, (2) high glass
transition concentration, and (3) low glass transition
concentration. Contrasting dissolution characteristics
are shown for the effect of different types of
polymer-solvent pairs as well as for the effect of
different molecular weights for the same type of
polymer-solvent pair.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6125H (Structure of macromolecular and polymer
solutions (solubility, swelling, etc.); polymer melts);
A6140K (Structure of polymers, elastomers, and
plastics); A6470P (Glass transitions); A6475
(Solubility, segregation, and mixing); B0560 (Polymers
and plastics (engineering materials science))",
classification = "815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boundary-value problems; concentration; concentration
profile; dissolution dynamics; dissolution kinematics;
dissolving; electron resists; ethyl ketone; glass gel
interface; high glass transition; liquid gel interface;
low glass transition concentration; methyl; molecular;
numerical solution; polymer solutions; polymers;
polystyrene; rubber; Stefan boundary; swelling; value
problem; weights",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Gipstein:1977:PAE,
author = "Edward Gipstein and Augustus C. Ouano and Duane E.
Johnson and Omar U. {Need III}",
title = "Parameters Affecting the Electron Beam Sensitivity of
Poly(Methyl Methacrylate)",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "143--153",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Poly(methyl methacrylate), PMMA, is used as a model
polymer to determine quantitatively the effect of
molecular weight, molecular weight distribution, and
tacticity on electron beam sensitivity. The
heterotactic, syndiotactic, and isotactic stereoforms
of PMMA were synthesized with molecular weights ranging
from 10**4 to 10**7 and dispersivities from 1.2 to
about 10. The G-values as determined by gamma radiation
are about 1.3 and are independent of the three
parameters. The molecular size of the developer solvent
is shown to have a much greater effect on the
solubility rate than the molecular weight of the
resist. An optimal developer solvent for PMMA can be
systematically selected from a homologous series of
n-alkyl acetates which enhance the resist
sensitivity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics (engineering materials
science))B2550 (Semiconductor device technology);
B2550G (Lithography)",
classification = "815; 932",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alkyl acetates; developer solvent; distribution;
electron beam; electron beam sensitivity; electron
beams; electron resists; G-values; heterotactic
poly(methyl; isotactic stereoforms; methacrylate);
molecular size; molecular weight; molecular weight
ratio; n-; PMMA; polymer; polymers; positive resists;
relative solubility rates; resist sensitivity;
sensitivity; syndiotactic poly(methyl methacrylate);
tacticity",
treatment = "A Application; X Experimental",
}
@Article{Smith:1977:SRP,
author = "Thor L. Smith",
title = "Strength and Related Properties of Elastomeric Block
Copolymers",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "154--167",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Stress-strain curves of single-phase noncrystallizable
elastomers over extended ranges of temperature and
extension rate are considered qualitatively along with
phenomenological and mechanistic aspects of fracture.
Data are presented to show that single-phase
noncrystallizable elastomers lack toughness except when
segmental mobility is sufficiently low so that
viscoelastic processes near the tip of a slowly growing
crack effectively retard its growth. Highly effective
strengthening mechanisms are imparted by plastic
domains which results from phase separation in
elastomeric block copolymers and from strain-induced
crystallization in certain elastomers. The stiffness,
tensile strength, and extensibility of a
poly(urea-urethane) and three polyurethane elastomers
over a broad temperature range are discussed in terms
of the type, size, and concentration of the
domain-forming segments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A6220D (Elasticity, elastic constants);
A6220F (Deformation and plasticity); A6220M (Fatigue,
brittleness, fracture, and cracks); A8140J (Elasticity
and anelasticity); A8140L (Deformation, plasticity and
creep); A8140N (Fatigue, embrittlement, and fracture)",
classification = "815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "block copolymers; crystallization; elastic constants;
elastomers; extensibility; fracture; mechanisms;
noncrystallizable elastomers; phase separation; plastic
domains; poly(urea urethane); polyurethane elastomers;
relations; stiffness; strain induced; strengthening;
stress strain curves; stress-strain; tensile strength",
treatment = "X Experimental",
}
@Article{Swalen:1977:PPT,
author = "Jerome D. Swalen and Randolph Santo and Maurus Tacke
and Josef Fischer",
title = "Properties of Polymeric Thin Films by Integrated
Optical Techniques",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "168--175",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Report on an innovative procedure for taking
measurements using integrated optical techniques on a
number of polymers fabricated into thin film form and
used as optical waveguides. Refractive index (including
anisotropy), absorption and scattering, and film
thickness have been determined by light guiding
properties. Techniques for film preparation, including
doctor blading, dipping, horizontal flowing, and
spinning, are also discussed. The polymers studied are
poly(methyl methacrylate), poly(vinyl-formal),
polyacrylonitrile, poly(vinyl alcohol), poly(vinyl
pyrrolidone), poly(vinyl benzoate), and polystyrene.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4280L (Optical waveguides and couplers); A4282
(Integrated optics); A7820D (Optical constants and
parameters); A7865J (Optical properties of nonmetallic
thin films); B0560 (Polymers and plastics (engineering
materials science)); B4110 (Optical materials); B4130
(Optical waveguides); B7320P (Optical variables
measurement)",
classification = "741; 815",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "absorption; anisotropy; blading; dipping; doctor; film
thickness; horizontal flowing; index measurement;
integrated optical techniques; integrated optics;
integrated optics --- Applications; measurement;
optical films; optical variables; optical waveguides;
poly(methyl benzoate); poly(vinyl alcohol); poly(vinyl
formal); poly(vinyl methacrylate); poly(vinyl
pyrrolidone); polyacrylonitrile; polymer films;
polymers; polystyrene; refractive; refractive index;
scattering; spinning; thin film preparation",
treatment = "P Practical; X Experimental",
}
@Article{Berry:1977:SDS,
author = "Brian S. Berry and John R. Susko",
title = "Solubility and Diffusion of Sulfur in Polymeric
Materials",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "176--189",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Radiotracer techniques were used to study the sorption
of sulfur vapor by silicone and epoxy polymers and to
obtain information on the diffusion of sulfur in these
materials. Sulfur is found to enter silicone polymers
solely by a physical solution process which obeys
Henry's law. The heat of solution is large (minus 0.43
eV) and at room temperature the solubility coefficient
is at least five orders of magnitude greater than for
many fully gaseous solutes, a results which fits an
empirical rule relating the solubility coefficient of a
given solute to its boiling point. The rapid diffusion
of sulfur in silicone rubber necessitated measurements
of the diffusion coefficient D by a vacuum desorption
technique. The activation energy Q and pre-exponential
constant D$_0$ are found to be 0.74 eV and 4 multiplied
by 10**5 cm**2/s, respectively. Corresponding values
for the epoxy, as determined by a steady state
permeation method, are 1.06 eV and 3 multiplied by
10**5 cm**2/s. These relatively large activation
energies and preexponential factors are thought to
reflect the large size of the S$_8$ molecule.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "804; 815; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "polymers; sulfur --- Diffusion",
}
@Article{Washo:1977:RMS,
author = "Basil D. Washo",
title = "Rheology and Modeling of the Spin Coating Process",
journal = j-IBM-JRD,
volume = "21",
number = "2",
pages = "190--198",
month = mar,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This study examines the spin coating process both
experimentally and from a fundamental point of view.
The analysis has produced a model and a quantitative
relationship between spin coating thickness and
pertinent material and process variables. The model
predicts that the simplest and most reproducible
results occur in a region which is independent of
thickness and time and is characterized by low steady
state radial flow on the substrate. The model also
includes a time-dependent term, shown to be important
for the region of high radial flow --- fluids of
relatively low viscosity and process conditions of
relatively high speed and\slash or long times.
Experimentally, Newtonian-like polyamide in iso-amyl
alcohol solutions is examined on large rotating
substrates, and measurements showed excellent
correlation with the model. This process has
applications in the electronics industry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8160C (Surface treatment and degradation of
semiconductors); B0170G (General fabrication
techniques); B0560 (Polymers and plastics (engineering
materials science))",
classification = "714",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "coating techniques; dependence; iso-amyl alcohol
solutions; model; non Newtonian fluids; polyamide;
polymer; polymer solutions; rheology; semiconductor
device manufacture; solutions; spin coating process;
spin coating thickness; substrate size",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Dill:1977:TEP,
author = "Frederick H. Dill and Jane M. Shaw",
title = "Thermal Effects on the Photoresist {AZ1350J}",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "210--218",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An experimental study is reported on the various
effects produced by the baking steps normally used in
processing positive photoresists for application in
microelectronics. The particular material investigated
is AZ1350J. The thermal effects are studied in terms of
a newly modified model that characterizes the exposure
and development processes in photoresist. The changes
in performance of the photoresist as a result of
prebake, post-exposure bake, and post-development bake
are discussed and are related to the parameters in the
model that govern exposure and development. The model
is derived from physical rather than chemical
measurements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550 (Semiconductor device technology);
B2550G (Lithography)",
classification = "714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "development bake; development processes; electron
device manufacture; exposure; heat treatment;
integrated circuit technology; model; photoresists;
positive photoresists; post; post exposure bake;
prebake; thermal effects",
treatment = "X Experimental",
}
@Article{Shaw:1977:TAP,
author = "Jane M. Shaw and Margaret A. Frisch and Frederick H.
Dill",
title = "Thermal Analysis of Positive Photoresist Films by Mass
Spectrometry",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "219--226",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Mass spectrometry is used to monitor the effect of
temperature on positive photoresist and its two major
components, a base resin and a photoactive compound.
This technique is also used to identify the photolytic
products of photoresist by exposing it in situ to
ultraviolet radiation and to identify the resulting
volatile products when it is heated after exposure.
Quantitative data are obtained for the two major
thermal products of photoresist, and the activation
energy is calculated for the thermal degradation of the
photoactive compound.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550 (Semiconductor device technology);
B2550G (Lithography)",
classification = "714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "activation energy; base resin; degradation; effect of
temperature; effects; electron device manufacture; mass
spectrometer applications; photoactive compound;
photolytic products; photoresists; positive
photoresist; products; radiation; thermal; thermal
products; ultraviolet radiation effects; volatile",
treatment = "P Practical; X Experimental",
}
@Article{DiMaria:1977:CSS,
author = "Donelli J. DiMaria and Patrick C. Arnett",
title = "Conduction Studies in Silicon Nitride: Dark Currents
and Photocurrents",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "227--244",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Dark conduction and photoconduction phenomena in
amorphous, stoichiometric Si$_3$N$_4$ films
incorporated into metal-silicon nitride-silicon (MNS)
structures are studied in detail. Results demonstrating
the importance of hole conduction in Si$_3$N$_4$ thin
films are presented. the importance of trapped space
charge injected from the contacts is shown in an
analysis of the effects of Si$_3$N$_4$ thickness and
the choice of gate metal on conduction. Contact effects
that are apparent in the current characteristics of
thin Si$_3$N$_4$ layers become dominated by bulk
conduction mechanisms as the silicon nitride film
increases in thickness. Optical interference effects in
photoconduction are used to determine the origin of
photocarriers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7240 (Photoconduction and photovoltaic effects;
photodielectric effects); A7340Q
(Metal-insulator-semiconductor structures); A7360H
(Electronic properties of insulating thin films);
B2530F (Metal-insulator-semiconductor structures)",
classification = "708; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "4/ thickness; amorphous stoichiometric Si/sub 3/N/sub
4/; contact; dark currents; effects; electronic
conduction; electronic conduction in insulating thin
films; films; gate metal; hole conduction; insulating;
insulator-semiconductor structures; metal silicon
nitride silicon; metal-; MNS; MnS structures; optical
interference effects; photoconduction;
photoconductivity; Si/sub 3/N/sub; silicon compounds;
silicon nitride; structure; thin films; trapped space
charge",
treatment = "T Theoretical or Mathematical",
}
@Article{Herbst:1977:ASV,
author = "Noel M. Herbst and Chao-Ning N. Liu",
title = "Automatic Signature Verification Based on
Accelerometry",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "245--253",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The fine structure of the muscle forces that are
exerted during the writing of a signature is constant
and well defined for most people. In general, the fine
structure is not subject to conscious control. Based on
these observations, an experimental system has been
designed that utilizes a person's signature dynamics to
verify identities. The design and operational features
of this system are described. Experiments on 70
subjects during a four-week period show a 2.9 percent
rejection of valid signatures and a 2.1 percent
acceptance of forgeries. An average of 1.2 trials was
necessary for verification. The forgers were
knowledgeable about the verification technique and did
their best to deceive the system. The acceptance rate
of random forgeries, i.e., accidental matching of two
separate signatures, was 0.16 percent.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
classification = "715",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "accelerometry; automatic signature verification;
character recognition; character recognition equipment;
computerised pattern; computerised pattern recognition;
electronic crime countermeasures; equipment;
handwriting pressure; recognition; security of data;
signature dynamics",
treatment = "P Practical; X Experimental",
}
@Article{Maruyama:1977:DLC,
author = "Kyoshi Maruyama and Donald T. Tang",
title = "Discrete Link Capacity and Priority Assignments in
Communication Networks",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "254--263 (or 255--263??)",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Consideration of the problem of discrete link capacity
assignment in store-and-forward packet switching
communication networks. Our problem formulation calls
for minimizing the network cost while satisfying all
the average packet delay constraints specified for
different classes of packets. Heuristic algorithms
which give near-optimal solutions of the problem are
developed. A description is given of a discrete link
capacity assignment algorithm for networks with
arbitrarily defined classes of packets having
individual delay constraints. The problem of priority
assignment on different classes of packets is then
investigated, and an algorithm is developed which
assigns suboptimal priorities on classes of packets
based on parameters such as delay requirement, path
length, packet length, and packet rate.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B0260 (Optimisation
techniques); B6210L (Computer communications); C1140C
(Queueing theory); C1180 (Optimisation techniques);
C5620 (Computer networks and techniques)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "assignment; average packet delay constraints; CAD;
computer communication networks; computer networks;
delay requirement; discrete link capacity; discrete
link capacity assignments; economics; heuristic
algorithm; minimisation; network cost minimisation;
packet; packet length; packet rate; packet switching;
path length; priority assignment; priority queueing
discipline; queueing theory; store and forward packet
switching; suboptimal priorities; switching",
treatment = "A Application; E Economic; T Theoretical or
Mathematical",
}
@Article{Chow:1977:BPA,
author = "We-Min M. Chow and Lin S. Woo",
title = "Buffer Performance Analysis of Communication
Processors During Slowdown at Network Control",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "264--272",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An approximate model based on renewal theory is
developed for the performance analysis of communication
processors during Network Control program (NCP)
slowdown. Performance values, which include cycle
length, buffer utilization, and message loss, were
computed as functions of traffic loads and
user-assigned threshold values of free buffers were
used for slowdown control. Comparison of results
obtained by the approximate method with simulated
results shows a high degree of accuracy for the
approximation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "approximate model; buffer performance analysis; buffer
utilization; communication processors; computer
networks; cycle length; loads; message loss; modelling;
network control program; renewal theory; slowdown
control; traffic; user assigned threshold values",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Lang:1977:ICL,
author = "Tomas Lang and Eduardo B. Fern{\'a}ndez",
title = "Improving the Computation of Lower Bounds for Optimal
Schedules",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "273--280",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B25 (68A20)",
MRnumber = "56 \#7917",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Ways of decreasing the number of operations needed to
compute the lower bounds of optimal schedules, by
reducing the number of time intervals that must be
considered, are presented. The bounds apply to a system
of identical processors executing a partially ordered
set of tasks, with known execution times, using a
non-preemptive scheduling strategy. In one approach we
find that the required number of intervals depends on
the graph. in our other approach, which subsumes the
first, the number of intervals is decreased to at most
min left bracket D**2/2, n**2 right bracket, where D is
the deadline to complete the tasks and n is the number
of tasks. The actual number of intervals for a
particular graph can be considerably smaller than this
worst case.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6150J
(Operating systems)",
classification = "723",
corpsource = "Computer Sci. Dept., Univ. of California, Los Angeles,
CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; lower bounds;
multiprocessing system; multiprocessing systems;
optimal schedules; scheduling",
reviewer = "Kenji Onaga",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Wong:1977:DMF,
author = "Chak-Kuen K. Wong and Donald T. Tang",
title = "Dynamic Memories with Faster Random and Sequential
Access",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "281--288",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "56 \#4284",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Extension of the dynamic memory proposed by A. V. Aho
and J. D. Ullman in two directions. Instead of a
shuffle permutation, block shuffles are introduced. By
choosing suitable block sizes, faster random and
sequential access may result. Another direction of
extension comes from the addition of a reverse cyclic
permutation, which results in even faster random and
sequential access. Analyses for both the worst and the
average cases are given. Generalizations to arbitrary
radices are also discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "arbitrary radices; block shuffles; cyclic permutation;
data storage, digital; digital storage; dynamic
memories; dynamic memory; fast; file organisation;
random access; reverse; sequential access",
reviewer = "I. Kaufmann",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Feliss:1977:CPS,
author = "Norbert A. Feliss and Frank E. Talke",
title = "Capacitance Probe Study of Rotating-Head\slash Tape
Interface",
journal = j-IBM-JRD,
volume = "21",
number = "3",
pages = "289--293",
month = may,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A modified version of the capacitance probe technique
is used to investigate the head-tape interface in a
rotating head configuration. The relationship between
air-bearing spacing and contour design is studied as a
function of tape tension, head protrusion, and
velocity; in addition, the effect of wave dynamics on
flying height is examined. These results are relevant
to the design of magnetic recording heads.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B7310J (Impedance and
admittance measurement); C5320C (Storage on moving
magnetic media)",
classification = "722; 752",
corpsource = "IBM General Products Div., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
keywords = "capacitance measurement; capacitance probe; data
storage, magnetic --- Tape Storage; equipment; head
protrusion; magnetic heads; magnetic recording heads;
magnetic tape; magnetic tape equipment; probes; tape
recorders; tape tension; velocity; wave dynamics",
treatment = "P Practical; X Experimental",
}
@Article{Gaur:1977:TAH,
author = "S. P. Gaur",
title = "Two-Dimensional Analysis of High-Voltage Power
Transistors",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "306--314",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The internal behavior of a typical n-p-n** minus -n**
plus high voltage power transistor is presented for
several specific steady-state operating conditions
obtained from a two-dimensional mathematical model.
Internal self-heating and avalanche multiplication
effects are taken into account. Poisson's equation,
electron and hole continuity equations, and the heat
flow equation are solved numerically in a
two-dimensional region with the input parameters of
device dimensions, doping profile, boundary conditions
for external contacts, and various material constants
for silicon. The collector n** minus -n** plus
interface is the region of high electrical and thermal
stress that causes second breakdown failure at
high-voltage and high-current operating conditions. The
combined effects of various high-injection levels are
illustrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors)",
classification = "714",
corpsource = "IBM System Products Div. Lab., East Fishkill, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "-/-n/sup +/ transistor; avalanche multiplication
effects; bipolar transistors; continuity equations;
electric breakdown of solids; electrical stress; heat
flow equation; heating; high injection levels; high
voltage power transistor; internal self; n-p-n/sup;
Poisson's equation; power; second breakdown failure;
semiconductor device models; Si; thermal stress;
transistors; two dimensional model",
treatment = "T Theoretical or Mathematical",
}
@Article{Zable:1977:SDI,
author = "J. L. Zable",
title = "Splatter During Ink Jet Printing",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "315--320",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When an ink drop traveling at relatively high velocity
impinges on a flat surface such as paper, part of the
drop breaks up into many very small droplets that are
deposited at other points. If these droplets are
relatively large, then visible splatter results.
Various parameters (ink properties, drop velocity, drop
volume, space between drops, etc.) are investigated to
determine their effect upon splatter and hence print
quality. Print samples were made while varying these
parameters, and the resulting print quality was
assessed. A simple relationship among the kinetic
energy of the drops, the overlap between drops, and
print quality based upon splatter is developed. This
relationship can be used to establish design boundaries
in an ink jet printer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722",
corpsource = "IBM System Communications Div. Lab., Endicott, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; drop velocity; drop
volume; energy; ink jet printer; ink jet printing;
kinetic; print quality; printers; splatter",
treatment = "P Practical; X Experimental",
}
@Article{Lieberman:1977:AAP,
author = "L. I. Lieberman and M. A. Wesley",
title = "Autopass: an Automatic Programming System for Computer
Controlled Mechanical Assembly",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "321--333",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An experimental very high level programming system for
computer controlled mechanical assembly, AUTOPASS
(AUTOmated Parts ASsembly System) is described. The
AUTOPASS language is oriented toward objects and
assembly operations, rather than motions of mechanical
assembly machines. It is intended to enable the user to
concentrate on the overall assembly sequence and to
program with English-like statements using names and
terminology that are familiar to him. To relate
assembly operations to manipulator motions, the
AUTOPASS compiler uses an internal representation of
the assembly world. This representation consists of a
geometric data base generated prior to compilation and
updated during compilation; it thus represents the
state of the world each assembly step. The level of the
language has been chosen to provide a high degree of
assistance to the user without the system's having to
perform artificial intelligence type problem solving
operations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6140D (High
level languages); C7420 (Control engineering
computing); C7440 (Civil and mechanical engineering
computing)",
classification = "402; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "assembling; automatic programming; automatic
programming system; AUTOPASS; computer; computer
programming; control; controlled mechanical assembly;
industrial computer; industrial computer control;
industrial plants --- Automation; problem oriented
language; problem oriented languages; very high level
programming system",
treatment = "A Application; P Practical",
}
@Article{Nussbaumer:1977:LFT,
author = "H. J. Nussbaumer",
title = "Linear Filtering Technique for Computing {Mersenne}
and {Fermat} Number Transforms",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "334--339 (or 335--339??)",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "394.65043",
abstract = "The implementation of pseudo-Mersenne and Fermat
Number Transforms is discussed. It is shown that some
pseudo-Mersenne Transforms can be computed efficiently
by a linear filtering approach. This approach is
extended to cover the case of Fermat and pseudo-Fermat
Number Transforms by using a special coding scheme for
implementing arithmetic operations in a Fermat number
system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0230 (Integral transforms); B1270F (Digital filters);
B6140 (Signal processing and detection); C1130
(Integral transforms); C5230 (Digital arithmetic
methods); C5240 (Digital filters)",
classification = "723",
corpsource = "IBM France, Centre d'Etudes et Recherches, La Gaude,
France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "digital arithmetic; digital filters; Fermat number;
filtering and; linear filtering; Mersenne transform;
prediction theory; signal filtering and prediction;
transform; transforms",
treatment = "T Theoretical or Mathematical",
}
@Article{Kiwimagi:1977:WPE,
author = "R. Kiwimagi and L. Griffiths and R. Furtney",
title = "Worst-Case Pattern Evaluation of Baseband Channels",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "340--349",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A05",
MRnumber = "56 \#11486",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new method is presented for evaluating the
performance of communication systems that use
binary-valued signaling formats. This technique permits
selection of the best overall code for a particular
channel or, alternatively, provides a method for
comparing different channels that use the same
transmission code. Encoded waveforms at the channel
input are presumed to be generated by a
constrained-coding procedure, which ensures, for
example, that the resulting binary waveform has a
certain minimum number of transitions per unit time,
limited digital sum variations (DSV), among other
characteristics. With this method, one first determines
that particular sequence (within the given code
constraints) that produces the maximum amount of
intersymbol-interference when transmitted through given
channel. A dynamic-programming procedure is used to
compute this sequence. Overall channel performance is
evaluated by calculating the probability of error and
the minimum eye-pattern opening. Numerical examples
illustrating the procedure for a synthetic channel are
presented and analyzed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6210Z (Other data transmission)",
classification = "731",
corpsource = "IBM General Products Div. Lab., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "baseband channels; binary transmission channels;
codes; communication channels; digital communication;
dynamic programming; error statistics; information
theory; interference; intersymbol; pattern evaluation;
performance of communication systems; probability of
error; synthetic channel; systems; worst case",
reviewer = "Harry H. Tan",
treatment = "N New Development; T Theoretical or Mathematical",
}
@Article{Chaitin:1977:AIT,
author = "G. J. Chaitin",
title = "Algorithmic information theory",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "350--359",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A15 (68A20)",
MRnumber = "56 \#15151",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240Z (Other topics in statistics); B6110
(Information theory); C1260 (Information theory); C4210
(Formal logic); C4240 (Programming and algorithm
theory)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm theory; algorithmic information theory;
functions; information theory; probability; recursive;
recursive function theory",
reviewer = "Robert P. Daley",
treatment = "T Theoretical or Mathematical",
}
@Article{Maruyama:1977:HDA,
author = "K. Maruyama and L. Fratta and D. T. Tang",
title = "Heuristic Design Algorithm for Computer Communication
Networks with Different Classes of Packets",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "360--369",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A typical operating environment of a packet switching
(store-and-forward) computer communication network is
that it is shared by many users with different classes
of packets. Packets may be classified in a very general
fashion by types of users, messages, applications,
transactions, response time requirements, packet
parameters such as packet rate and length, and by
network parameters such as source-destination and path
length. A well-designed network must provide access and
performance assurance to all packet classes. This paper
presents a heuristic algorithm for designing such a
communication network. The algorithm presented contains
heuristic algorithms for discrete link capacity
assignment, priority assignment, and flow assignment
problems with an additional feature which allows one to
alter network topology interactively. Sample results
from applications of the overall network design are
also given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques); C7410F (Communications
computing); C7430 (Computer engineering)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; assignment; CAD; communications computing;
computer communication network; computer networks;
discrete link capacity assignment; flow assignment;
heuristic; packet; packet switching; priority;
switching",
treatment = "A Application",
}
@Article{Lam:1977:QNP,
author = "S. S. Lam",
title = "Queueing networks with population size constraints",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "370--378",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25",
MRnumber = "56 \#16836",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6210L (Computer
communications); C1140C (Queueing theory); C5620
(Computer networks and techniques)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arrivals; communication systems; computer; computer
networks; data communication systems; dependent lost
arrivals; flow control constraints; multiple routeing
subchains; population size constraints; queueing;
queueing networks; state; storage constraints; theory;
triggered",
reviewer = "Masafumi Sasaki",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Albrecht:1977:EDR,
author = "D. M. Albrecht and E. G. Laenen and Chua Lin",
title = "Experiments on the Dynamic Response of a Flexible
Strip to Moving Loads",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "379--383",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental findings are reported on the dynamic
response of a flexible strip to moving loads traveling
at an oblique angle to its edges. The strip is wrapped
under tension around a pair of supporting pressurized
cylinder halves. The moving loads are applied to the
flexible strip at the gap between the two cylinder
halves. A capacitance displacement transducer measures
the dynamic response of the strip, which is shown in
isometric perspective for various boundary conditions.
It is shown that waves on the strip created by the
moving loads can be eliminated by providing a
hydrodynamic air film support to the flexible strip in
the vicinity of the moving loads. Experiments
demonstrate that response to the loads along the edges
of the strip differs from that near its center, which
is to be expected because of the reflection of flexural
waves from the boundaries of the strip. These results
are relevant to magnetic tape recording devices.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "722",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic",
}
@Article{Lam:1977:EMR,
author = "S. S. Lam",
title = "An extension of {Moore}'s result for closed queuing
networks",
journal = j-IBM-JRD,
volume = "21",
number = "4",
pages = "384--387",
month = jul,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25 (90B20)",
MRnumber = "56 \#6924",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "closed queueing network; exponential; nondistinct
traffic intensities; normalization constant; queueing
networks; queueing theory; semiclosed; servers",
reviewer = "Masafumi Sasaki",
treatment = "T Theoretical or Mathematical",
}
@Article{Lee:1977:AMC,
author = "Hsing-San S. Lee",
title = "Analysis of the merged charge memory ({MCM}) cell",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "402--414",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Description of a digital processing method applicable
to a synthetic aperture radar, to be carried by the
space shuttle or by satellites. The method uses an
earth-fixed coordinate system in which corrective
procedures are invoked to compensate for errors
introduced by the satellite motion, earth curvature,
and wavefront curvature. Among the compensations
discussed are those of the coordinate system, skewness,
roll, pitch, yaw, earth rotation, and others. The
application of a Fast Fourier Transform in the
numerical processing of the two-dimensional convolution
is discussed in detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570F (Other MOS integrated
circuits); C5320G (Semiconductor storage)",
classification = "714; 721; 722",
corpsource = "IBM System Products Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cellular arrays; charge equivalent circuit;
charge-coupled device circuits; chip design
constraints; circuits; data storage, semiconductor;
density; dynamic potential well; equivalent; integrated
memory circuits; merged charge memory cell; merged
surface charge transistor structure; MOS dynamic RAM;
polysilicon electrode; random-access storage; spatial",
treatment = "A Application",
}
@Article{vandeLindt:1977:DTG,
author = "W. J. {van de Lindt}",
title = "Digital Technique for Generating Synthetic Aperture
Radar Images",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "415--432",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Description of a digital processing method applicable
to a synthetic aperture radar, to be carried by the
space shuttle or by satellites. The method uses an
earth-fixed coordinate system in which corrective
procedures are invoked to compensate for errors
introduced by the satellite motion, earth curvature,
and wavefront curvature. Among the compensations
discussed are those of the coordinate system, skewness,
roll, pitch, yaw, earth rotation, and others. The
application of a Fast Fourier transform in the
numerical processing of the two-dimensional convolution
is discussed in detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B6310 (Radar
theory)",
classification = "716; 723",
corpsource = "IBM Federal Systems Div., Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace instrumentation; compensations; coordinate
system; corrective procedures; data processing ---
Applications; digital processing method; Earth fixed;
error compensation; fast Fourier; fast Fourier
transform; picture processing; radar; radar displays;
satellites; signal processing --- Digital Techniques;
space shuttle; synthetic aperture radar images;
transforms",
treatment = "A Application",
}
@Article{Gaur:1977:SOA,
author = "Santosh P. Gaur",
title = "Safe Operating Area for Bipolar Transistors",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "433--442",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A mathematical model is utilized to predict the safe
operating area (SOA) for proper circuit applications of
bipolar transistors in the forward as well as reverse
operating regions. Nonuniformity of the temperature
within the transistor structure due to internal
self-heating and the avalanche multiplication effect in
the reverse operating region, which cause second
breakdown failure, are taken into account. Steady-state
electrical and time-dependent thermal problems are
solved to establish stability of a specified operating
condition. Safe operating area curves for three
transistor designs of similar power handling capability
are presented. Current density and temperature
distributions within the transistor structure for
various operating conditions in the stable as well as
unstable regions are presented. suitability of $V_BE$
to estimate peak temperature within the device is
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors)",
classification = "714",
corpsource = "IBM System Products Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "area; avalanche multiplication effect; bipolar
transistors; current density; current density
distributions; device models; failure; internal;
mathematical model; safe operating; safety; second
breakdown; selfheating; semiconductor; stability;
temperature distribution; temperature distributions;
transistors, bipolar",
treatment = "T Theoretical or Mathematical",
}
@Article{Kou:1977:MBP,
author = "Lawrence T. Kou and George Markowsky",
title = "Multidimensional Bin Packing Algorithms",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "443--448",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A10",
MRnumber = "56 \#13764",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A comparative study is made of algorithms for a
general multidimensional problem involving the packing
of k-part objects in k compartments in a large supply
of bins. The goal is to pack the objects using a
minimum number of bins. The properties and limitations
of the algorithms are discussed, including
k-dimensional analogs of some popular one-dimensional
algorithms. An application of the algorithms is the
design of computer networks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1180 (Optimisation techniques); C7430 (Computer
engineering)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bin packing algorithms; compartments; computer
networks; design of computer networks; general
multidimensional problem; integer programming;
mathematical programming; minimisation; network
synthesis",
reviewer = "Frank K. Hwang",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Peters:1977:ZON,
author = "Robert J. Peters",
title = "Zero Order and Nonzero Order Decision Rules in Medical
Diagnosis",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "449--460 (or 449--450??)",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In searching for the optimal solution to the medical
diagnostic problem, it seems useful to distinguish
between different possible decision rules (strategies).
Two different classes of decision rules are considered:
nonzero order decision rules and constant or zero order
decision rules. For each class, solution methods as
well as heuristic approaches to finding the optimal
member of the class are discussed. As an exercise, the
diagnosis of a hematologic disease belonging to the
group macrocytic anemia is considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140E (Game theory); C1180 (Optimisation techniques);
C1290L (Systems theory applications in biology and
medicine)",
classification = "416; 921",
corpsource = "Faculty of Economics, Univ. of Groningen, Groningen,
Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approaches; biomedical engineering; decision theory
and analysis; heuristic; mathematical programming;
mathematical programming --- Applications; medical
diagnosis; nonzero order decision rules; optimal;
patient diagnosis; solution; solution methods;
strategies; zero order decision rules",
treatment = "T Theoretical or Mathematical",
}
@Article{Inselberg:1977:VGC,
author = "Alfred Inselberg",
title = "Variable Geometry Cochlear Model at Low Input
Frequencies: a Basis for Compensating Morphological
Disorders",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "461--478",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The implementation of an algorithm suitable for
interactive experimentation with a mathematical model
of the cochlea is described. In the model, the
cochlea's exterior shell is represented by a surface of
revolution. Internally, the cochlea is partitioned
symmetrically into two chambers (the scalae) by a
midplane representing the basilar membrane with its
bony supports together with the ``collapsed'' cochlear
duct (third chamber). The two chambers are filled with
a viscous and incompressible fluid and communicate
through a small opening (the helicotrema), at the
cochlea's apex. the system is driven by the piston-like
movement with frequency omega of the stapes at the
cochlea's basal end. An isotropic sectorial plate
widening toward the apex represents the basilar
membrane. Some of the effects of the cochlear duct are
considered through a provision for nonzero net pressure
at the basilar membrane's apical end.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8720E (Natural and artificial biomembranes); A8734
(Audition); C1290L (Systems theory applications in
biology and medicine)",
classification = "461; 921",
corpsource = "IBM Los Angeles Sci. Center, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; basilar membrane; biomedical engineering;
biomembranes; chambers; cochlear model; ear; isotropic
sectorial; LF; midplane; morphological disorders;
physiological models; plate",
}
@Article{Fleischer:1977:LSI,
author = "John M. Fleischer and Milton R. Latta and Melbourne E.
Rabedeau",
title = "Laser-Optical System of the {IBM 3800} Printer",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "479--483",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A helium-neon laser, acousto-optical modulator and
rotating polygonal mirror are used for the optical
design of a computer printout system. This combination
of technologies in the printer produces high-quality
nonimpact printing at speeds of 23,000 to 52,000
characters per second. a new technique utilizing a
cylindrical\slash toroidal lens pair is described which
reduces, by two orders of magnitude, scan line
displacement errors produced by the polygonal mirror.
The optical design principles and alignment techniques
used in the assembly are shown.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 744",
corpsource = "General Products Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acousto-optical devices; alignment techniques;
applications; aspherical lenses; computer peripheral
equipment; computer printout; cylindrical/toroidal lens
pair; laser beam; lasers --- Applications; mirrors;
nonimpact printing; optical design; optical modulation;
optical systems; printers; rotating polygonal mirror;
scan line displacement errors; system",
treatment = "P Practical",
}
@Article{Delobel:1977:CDD,
author = "C. Delobel and R. G. Casey and P. A. Bernstein",
title = "Comment on: {``Decomposition of a data base and the
theory of Boolean switching functions''} {(IBM J. Res.
Develop. {\bf 17} (1973), 374--386) by Delobel and
Casey}",
journal = j-IBM-JRD,
volume = "21",
number = "5",
pages = "484--485",
month = sep,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A20",
MRnumber = "57 \#19121",
bibdate = "Mon Feb 12 08:07:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Delobel:1973:DDB}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230 (Switching theory); C6120 (File organisation)",
corpsource = "Univ. of Grenoble, Grenoble, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Boolean; Boolean functions; convection; data base
decomposition; database management systems; functional
dependencies; functions; third normal form",
reviewer = "J. C. Muzio",
treatment = "T Theoretical or Mathematical",
}
@Article{Davis:1977:ARE,
author = "D. E. Davis and R. D. Moore and M. C. Williams and O.
C. Woodard",
title = "Automatic Registration in an Electron-Beam
Lithographic System",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "498--505",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A description is given of pattern registration, a
process by which the circuit patterns required at a
particular level of device fabrication are mapped to
those of the preceding level. The considerations taken
as basic in designing an accurate, high-speed
registration process for a production-type
electron-beam exposure system are discussed. This
automatic registration system operates in 150
milliseconds per integrated circuit chip, allowing the
system to achieve a throughput of 2000 5-mm chips per
hour with overlay error of less than 0.75 $\mu$ m (3
sigma). The operation of this system, its performance
characteristics, and measurements of its
pattern-matching accuracy are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550G (Lithography); B2570 (Semiconductor
integrated circuits); C3355 (Control applications in
manufacturing processes)",
classification = "713; 745; 932",
corpsource = "IBM Systems Products Div. Lab., East Fishkill,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic registration system; circuit technology;
electron beam applications; electron beams ---
Applications; electron resists; integrated; integrated
circuit manufacture; lithography --- Applications;
manufacturing processes; pattern registration process;
photolithography",
treatment = "P Practical",
}
@Article{Engelke:1977:CND,
author = "H. Engelke and J. F. Loughran and M. S. Michail and P.
M. Ryan",
title = "Correction of Nonlinear Deflection Distortion in a
Direct Exposure Electron-Beam System",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "506--513",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A distortion correction technique is described, used
in a high-throughput electron-beam lithography exposure
system, which achieves an absolute deflection accuracy
of about 30 parts per million (ppm) throughout a 5-mm
field. To accomplish this, a cyclic, numerically
controlled magnetic deflection with an accuracy of
about 1000 ppm and high repeatability is first
established. Horizontal and vertical errors in this
deflection are measured by sensing the apparent
locations of features in a calibration grid that is
placed in the exposure field of the beam. The measured
error is smoothed by means of a two-dimensional
spline-fitting method, and the parameters for the
correction surfaces are calculated. Corrections to
position and speed, defined by a set of digital tables,
are superimposed on the basic deflection, and the
process is iterated until acceptable precision is
achieved. Parameters relating registration scans to
field-writing scans are then calculated for use in the
registration of all written fields.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550G (Lithography); B2570 (Semiconductor
integrated circuits); C3355 (Control applications in
manufacturing processes)",
classification = "713; 715; 932",
corpsource = "IBM Deutschland, Sindelfingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit technology; control; distortion correction
technique; electron beam applications; electron beam
exposure system; electron beams --- Applications;
electron resists; integrated; integrated circuit
manufacture; lithography --- Applications; magnetic
deflection; manufacturing processes; numerical;
numerical control",
treatment = "P Practical",
}
@Article{Mauer:1977:EOE,
author = "J. L. Mauer and H. C. Pfeiffer and W. Stickel",
title = "Electron Optics of an Electron-Beam Lithographic
System",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "514--521",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The electron optics of a practical scanning
electron-beam lithographic system (EL1) that provides
high-volume direct wafer exposure is described. The
throughput limitation inherent in serial exposure is
greatly reduced by exposing entire pattern segments
with a shaped beam. The shaped-beam concept represents
a combination of scanning and projection methods.
Twenty-five image points are exposed simultaneously to
increase the spot current accordingly over that of a
Gaussian round-beam system that exposes one image point
at a time. The higher total current could lead to
intensified Coulomb interaction between beam electrons,
causing excessive Boersch effect and additional
aberrations. However, the imaging and deflection
methods described here are shown, by theoretical and
experimental means, to reduce both the effects of
Coulomb interaction and the total aberration of the
system. This results in improvement of the beam current
and field coverage compared with those found in
conventional systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550G (Lithography); B2570 (Semiconductor
integrated circuits)",
classification = "711; 713; 745; 932",
corpsource = "IBM Systems Products Div. Lab., East Fishkill,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aberrations; Boersch effect; Coulomb; deflection
methods; direct wafer exposure; electron; electron beam
applications; electron beams --- Applications; electron
optics; imaging; integrated circuit manufacture;
integrated circuit technology; interaction;
lithographic; lithography --- Applications; resists;
shaped beam; system",
treatment = "P Practical",
}
@Article{Davies:1977:CMP,
author = "J. E. Davies",
title = "Control of Magnetic Properties During the Processing
of Single Crystal Garnet Films",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "522--527",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Thin single-crystal rare earth iron garnet films are
currently the most attractive materials for magnetic
bubble domain applications. To utilize their potential,
tight control of the magnetic properties is needed at
each of the film processing steps. Such steps include
the growth of large-area films from a supersaturated
PbO-B$_2$O$_3$ fluxed melt, the phosphoric acid
trimming of as-grown films to adjust the bubble
collapse field, ion implantation of the film surface to
suppress the formation of hard bubbles and the
subsequent annealing the implanted layer receives
during the thermal cycling of the device fabrication
steps. Control of film properties at each of these
stages will be discussed and data presented to show how
each of these stages may be optimized.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A7550G (Ferrimagnetics); A7570K (Domain structure in
magnetic films (magnetic bubbles)); A8110D (Crystal
growth from solution); A8115L (Deposition from liquid
phases (melts and solutions)); A8140E (Cold working,
work hardening; post-deformation annealing, recovery
and recrystallisation; textures); B0510D (Epitaxial
growth); B3110E (Ferrites and garnets); B3120L
(Magnetic bubble domain devices)",
classification = "701; 708",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealing; bubble collapse field; cycling; epitaxial
layers; film growth; films --- Magnetic Properties;
garnet film; garnets; ion implantation; liquid; liquid
phase epitaxial growth; magnetic; magnetic annealing;
magnetic bubble devices; magnetic bubble domain
devices; PbO-B/sub 2/O/sub 3/ fluxed melt; phase
epitaxial growth; phosphoric acid; thermal; thin single
crystal rare earth Fe; trimming",
treatment = "P Practical",
}
@Article{Bennett:1977:PCA,
author = "B. T. Bennett and P. A. Franaszek",
title = "Permutation Clustering: an Approach to On-Line
Storage Reorganization",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "528--533",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "366.68019",
abstract = "A class of dynamic reorganization algorithms is
described which embodies a number of desirable systems
properties. Experiments on a trace taken from a large
data base application indicate that a member of this
class may be used to obtain time-varying or quasistatic
organizations that exhibit improved paging
performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer programming ---
Subroutines; dynamic reorganization algorithms;
executive programs; file organisation; online storage
reorganisation; organisations; organizations; paging
performance; permutation clustering; quasistatic;
storage allocation; supervisory and; supervisory and
executive programs; time varying; virtual storage",
treatment = "P Practical; X Experimental",
}
@Article{Fagin:1977:FDR,
author = "R. Fagin",
title = "Functional dependencies in a relational database and
propositional logic",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "534--544",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "58 \#8578",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C6120 (File organisation)",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data structures; formal logic; functional dependency
statements; implicational statements; proof;
propositional logic; relational database; semantic
proof; syntactic",
reviewer = "Clement T. Yu",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Lavenberg:1977:SSR,
author = "S. S. Lavenberg and C. H. Sauer",
title = "Sequential stopping rules for the regenerative method
of simulation",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "545--558",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K30 (68A55)",
MRnumber = "57 \#14192",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140C (Queueing theory); C1140Z (Other topics in
statistics)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "confidence intervals; estimation; queueing systems;
queueing theory; regenerative simulation; regenerative
stochastic structure; sequential stopping rules;
simulation; stochastic systems",
reviewer = "Laurence L. George",
treatment = "T Theoretical or Mathematical",
}
@Article{Lomet:1977:DFA,
author = "D. B. Lomet",
title = "Data flow analysis in the presence of procedure
calls",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "559--571",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "366.68020",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6150C
(Compilers, interpreters and other processors)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; argument parameter aliasing; calling
interactions; combinatorial explosion of aliasing
computations; data flow; multiple procedures; program
compilers; programming theory; recursive procedures",
}
@Article{Traub:1977:PSN,
author = "R. D. Traub and J. P. Roth",
title = "Potential significance to neurophysiology of design
algorithms for digital computers",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "572--575",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290L (Systems theory applications in biology and
medicine); C7330 (Biology and medical computing)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "brain models; digital simulation; feedback; loops;
medical computing; nervous system; nets; neural;
neurophysiology; regular design; switching circuit",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Matino:1977:ESB,
author = "H. Matino and T. Ushiroda",
title = "Effect of Substrate Bias on Properties of
{RF}-sputtered {CR-SiO} Films",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "576--579",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Properties of rf-sputtered Cr-SiO cermet films have
been studied as a function of RF substrate bias. Films
with five orders-of-magnitude change in electrical
resistivity have been deposited from one Cr-SiO(50:50
wt \%) target by changing the substrate bias.
Resistivities of about 200 OMEGA multiplied by (times)
cm at 5\% bias and about 2 multiplied by 10** minus **3
OMEGA multiplied by (times) cm at 20\% bias have been
obtained.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7360 (Electronic properties of thin films); A8115C
(Deposition by sputtering); B0520F (Vapour
deposition)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cermet films; cermets; Cr-SiO cermet films; electrical
conductivity of solids; electrical resistivity; films;
radiofrequency; radiofrequency sputtering; sputtered
coatings; sputtering; substrate bias",
treatment = "X Experimental",
}
@Article{Cuomo:1977:OEN,
author = "J. J. Cuomo and R. J. Gambino and J. M. E. Harper and
J. D. Kuptsis",
title = "Origin and Effects of Negative Ions in the Sputtering
of Intermetallic Compounds",
journal = j-IBM-JRD,
volume = "21",
number = "6",
pages = "580--583",
month = nov,
year = "1977",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An unexpected etching phenomenon during the sputtering
of rare earth-gold alloys has been found to be caused
by a large flux of negative gold ions from the
sputtering target. This effect is found to occur in a
range of intermetallic compounds. A model is presented
which predicts when negative ion formation will be
important. Effects of negative ions on sputter
deposition of thin films include reduced deposition
rate or substrate etching, and changes in film
composition and other properties. Negative ion
formation must also be taken into account for accurate
quantitative analysis by Secondary Ion Mass
Spectrometry (SIMS).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7920N (Atom-, molecule-, and ion-surface impact);
A8115C (Deposition by sputtering); B0520F (Vapour
deposition)",
classification = "531; 539; 547",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Au alloys; deposition rate; etching phenomenon; film
composition; films --- Metallic; gold alloys;
intermetallics; metallic thin films; model; negative
ions formation; radiofrequency sputtering; rare earth
alloys; secondary ion mass spectrometry; sputtering;
substrate etching; thin films",
treatment = "X Experimental",
}
@Article{Findley:1978:CIP,
author = "G. I. Findley and D. P. Leabo and A. C. Slutman",
title = "Control of the {IBM 3800} Printing Subsystem",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "2--12",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The IBM 3800 Printing Subsystem is controlled by a
high-speed multilevel, interrupt-driven microprocessor.
The design of this system has included several
innovative concepts to take advantage of the
flexibility of electrophotographic laser printing. New
functions that are introduced include intermixed
pitches, fonts, and line spacings; user-alterable
character sets; on-line forms generation; and superior
retry, fail-soft and diagnostic capabilities.
Compatibility with the operational characteristics of
IBM 1403 and 3211 printers is maintained. This paper
discusses many of the objectives, development
tradeoffs, and resultant control implementations for an
on-line computer output printing subsystem.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3370Z (Other control applications in
telecommunications); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "722",
corpsource = "General Products Div. Lab., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "capabilities; character sets; computer output printing
subsystem; computer peripheral equipment; computerised
control; design; development; diagnostic;
electrophotographic laser printing; electrophotography;
flexibility; fonts; forms generation; IBM 3800 Printing
Subsystem; interrupt driven microprocessor; laser beam
applications; line; multilevel; operational
characteristics; pitches; printers; retry capabilities;
spacings; tradeoffs",
treatment = "A Application",
}
@Article{Svendsen:1978:PPO,
author = "R. G. Svendsen",
title = "Paper Path of an On-Line Computer-Output Printer",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "13--18",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper describes the development of a
paper-handling system designed to move paper at a speed
of 81 cm/s in the IBM 3800 Printing Subsystem. During
the development of the printer a number of unique
problems arose from the interaction among paperline
components. The various approaches and solutions to
these problems, including paper path alignment,
character stretch, registration within the fuser, and
path error detection, are discussed and illustrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722",
corpsource = "General Products Div. Lab., IBM San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "character; computer peripheral equipment; development;
error detection; IBM 3800 Printing Subsystem;
interaction among; materials handling; paper; paper
handling; paper path alignment; paperline components;
path error detection; printers; registration; stretch;
system",
treatment = "A Application",
}
@Article{Cameron:1978:PSD,
author = "T. J. Cameron and M. H. Dost",
title = "Paper Servo Design for a High Speed Printer Using
Simulation",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "19--25",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design of feedback systems for control of paper
motion through the IBM Printing 3800 Subsystem is
described. The main tool for analysis and optimization
is DSL, a digital simulation language for systems of
continuous nature. The several stages in the evolution
of the design are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3120C (Spatial variables control); C3370Z (Other
control applications in telecommunications); C5550
(Printers, plotters and other hard-copy output
devices)",
classification = "722; 723",
corpsource = "General Products Div. Lab., IBM San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; computer programming
languages; computer simulation; control of; design;
digital simulation; digital simulation language;
feedback; feedback systems; high speed printer; IBM
3800 Printing; optimisation; paper; paper motion;
position control; printers; servomechanisms;
Subsystem",
treatment = "A Application",
}
@Article{Brooms:1978:DFS,
author = "K. D. Brooms",
title = "Design of the Fusing System for an Electrophotographic
Laser Printer",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "26--71",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper discusses the development and design of the
fusing system used in the IBM 3800 Printing Subsystem.
The design solutions provide satisfactory fusing of
powdered toner print images to paper at a processing
rate of 81 cm/s under a variety of operating
conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "722; 744",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; laser beams ---
Applications",
xxnote = "Check pages: overlap with \cite{Vahtra:1978:EPH}.",
}
@Article{Vahtra:1978:EPH,
author = "U. Vahtra and R. F. Wolter",
title = "Electrophotographic process in a high speed printer",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "34--39",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
corpsource = "General Products Div. Lab., IBM San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer; design; electrophotographic;
electrophotography; hard copy; high speed printer; IBM
3800 Printing Subsystem; photographic process;
printers; process; system output printing",
treatment = "A Application",
xxnote = "Check pages: overlap with \cite{Brooms:1978:DFS}.",
}
@Article{Chu:1978:LSS,
author = "W. H. Chu and J. T. Jacobs",
title = "Light scattering study of structures in a smectic
liquid crystal",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "40--50",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6130E (Experimental determinations of smectic,
nematic, cholesteric, and lyotropic structures); A6470M
(Transitions in liquid crystals); A7835 (Brillouin and
Rayleigh scattering (condensed matter))",
corpsource = "Res. Div. Lab., IBM San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cooling rate; crystalline polymers; degree of
disorder; density fluctuations; light scattering;
liquid crystal phase transformations; orientation
fluctuations; rodlike; sample thickness; smectic liquid
crystal; smectic liquid crystals; spherulites;
structural order; structures; superstructures; surface
treatment",
treatment = "X Experimental",
}
@Article{Cox:1978:PEL,
author = "R. J. Cox and J. F. Johnson",
title = "Phase equilibria in liquid crystal mixtures",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "51--59",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6130 (Liquid crystals); A6470M (Transitions in liquid
crystals)",
corpsource = "Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; ascending solid; differential thermal;
equilibrium; heat of transformation; liquid crystal
mixtures; liquid crystal phase; mixtures; mixtures of
nonmesomorphic compounds; optical microscopy; phase;
phase equilibria; polarized light microscopy;
solutions; thermal analysis; thermodynamic
relationships; transformations; transition
temperatures",
treatment = "T Theoretical or Mathematical",
}
@Article{West:1978:AVC,
author = "C. H. West and P. Zafiropulo",
title = "Automated Validation of a Communications Protocol: The
{CCITT X.21} Recommendations",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "60--71",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210Z (Other data transmission); C5610 (Computer
interfaces)",
corpsource = "Zurich Res. Div. Lab., IBM Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automated communications protocol validation; call
establishment procedure; CCITT; computer interfaces;
data communication systems; interface; standardisation;
state diagram; X.21 interface",
treatment = "A Application; G General Review",
}
@Article{Michaelson:1978:RBA,
author = "H. G. Michaelson",
title = "Relation Between an Atomic Electronegativity Scale and
the Work Function",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "72--80",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recently compiled data for the first electron affinity
and the first ionization potential are used to obtain
values for an atomic electronegativity scale, based on
the Mulliken relation. From this scale and a new
compilation of work function data, a linear equation is
obtained which includes a parameter for any given
element, depending on its subgroup in the periodic
table. Data are plotted for 51 elements, including
simple metals, transition metals, and semiconductors.
These data fit the straight-line equation better than
10 percent. Data for the transition metals deviate
within the same limits as those for elements having
simpler electronic configurations. The
electronegativity scale differs significantly from the
Pauling scale and is shown to be a useful guide to
preferred values of the work function for elements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3510H (Atomic ionization potentials, electron
affinities); A7330 (Surface double layers, Schottky
barriers, and work functions)",
classification = "931",
corpsource = "Corporate Headquarters, IBM Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atomic; atomic electronegativity; electron affinity;
electronegativity; electronegativity scale; first
electron affinity; first ionization potential;
ionisation potential; linear equation; Mulliken
relation; physics; semiconductors; simple metals;
transition metals; work function",
treatment = "T Theoretical or Mathematical",
xxauthor = "H. B. Michaelson",
}
@Article{Doelman:1978:DAR,
author = "A. Doelman and A. R. Gregges and E. M. {Barrall II}",
title = "Data Acquisition and Reduction Program for
Thermogravimetry",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "81--89",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An on-line data acquisition system for
thermogravimetry using the IBM S/7 computer followed by
data reduction on a 360\slash 195 is described by means
of flow charts. The system is designed so that no
knowledge of programming is required to acquire,
display and manipulate data on an interactive graphics
terminal. The program not only extracts weight loss
data, but also computes the energies of activation, E,
for any selected weight loss interval by two methods,
i.e., tabular integral and derivative. The system is
demonstrated by a study of the activation energies for
loss of water, loss of carbon monoxide, and loss of
carbon dioxide during the thermal decomposition of
calcium oxalate monohydrate. The results are in good
agreement with the best literature values.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630E (Mass and density measurement); A0650D (Data
gathering, processing, and recording, data displays
including digital techniques); A8280 (Chemical analysis
and related physical methods of analysis); C7320
(Physics and chemistry computing)",
classification = "723; 801",
corpsource = "IBM Nederland, Zoetermeer, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "activation energies; analysis; computerised
instrumentation; data; data acquisition; data
acquisition system; data processing; data reduction;
flow charts; gravimetric analysis; interactive graphics
terminal; interactive terminals; loss; program;
reduction and analysis; thermal; thermal decomposition;
thermogravimetry; weight",
treatment = "A Application",
}
@Article{Bayer:1978:IJP,
author = "R. G. Bayer and J. L. Sirico",
title = "Influence of Jet Printing Inks on Wear",
journal = j-IBM-JRD,
volume = "22",
number = "1",
pages = "90--93",
month = jan,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper reports the results of wear tests performed
to determine the influence of jet printing inks on the
wear of several polymer-metal pairs, which were known
to be compatible with the inks. It is shown that these
inks generally tend to increase wear beyond that
occurring in a dry state. The principal reason for this
increase was concluded to be the adverse influence that
the inks have on the establishment of a beneficial
transfer film on the metal surface.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "745; 804",
corpsource = "Systems Products Div., IBM Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "beneficial transfer film; filled polymers; ink; jet
printing inks; jets; polymer/metal pairs; printers;
printing; wear",
}
@Article{Hovel:1978:NMD,
author = "H. J. Hovel",
title = "Novel Materials and Devices for Sunlight Concentrating
Systems",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "112--121",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Photovoltaic conversion under concentrated sunlight is
a highly promising technique that could make
solar-electric power generation economically
competitive with fossil fuel power generation by the
mid-1980s. An economic analysis has been performed
which demonstrates that solar cell efficiency,
concentrator efficiency, and concentrator cost are the
most important parameters in a concentrating
photovoltaic system; solar cell cost is only of
secondary importance (at least for Si solar cells). Six
novel structures are described, including modified
conventional Si cells, Ga$_{1-x}$Al$_x$As\slash GaAs
devices, interdigitated cells, vertical and horizontal
multijunction cells and ``multicolor'' devices.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8630J (Photoelectric conversion; solar cells and
arrays); B4250 (Photoelectric devices); B8110B (Power
system management, operation and economics); B8250
(Solar power stations and photovoltaic power systems);
B8420 (Solar cells and arrays)",
classification = "657; 702",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aluminium compounds; cell efficiency; cells;
concentrating photovoltaic system; concentrator cost;
concentrator efficiency; devices; economic analysis;
economics; Ga/sub 1-x/Al/sub; gallium arsenide;
horizontal; interdigitated cells; modified conventional
Si cells; multicolour; multijunction cells;
photovoltaic conversion; power generation; Si solar;
silicon; solar; solar cell cost; solar cells; solar
electric; solar energy concentrators; solar power;
solar radiation; stations; sunlight concentrating
systems; vertical multijunction cells; x/As/GaAs
devices",
treatment = "G General Review; N New Development",
}
@Article{Halpern:1978:SRH,
author = "P. Halpern and K. L. Coulson",
title = "Solar Radiative Heating in the Presence of Aerosols",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "122--133",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A theoretical study is carried out to evaluate the
effects of aerosols on the shortwave flux divergence in
the lower troposphere (0-2 km) by using four
computational methods: Gauss--Seidel iteration, a
reference method by which all orders of scattering are
accounted for, and three approximations, primary
scattering, no-scattering and median wavelength. By
using these procedures, the radiative transfer equation
is solved for a cloudless plane parallel atmosphere of
infinite extent in the horizontal, but of finite extent
in the vertical. The Gauss--Seidel procedure is taken
as a standard and comparisons of the flux divergence
are made by using various combinations of solar zenith
angle, aerosol size frequency distribution and aerosol
refractive index. In many of the simulations the median
wavelength approximation gives accuracies comparable to
those of the no-scattering approximation, in which case
the choice of method is based on the required
computational time. However, inaccuracies appear with
all the approximations and the degree of superiority of
one method over another depends on the aerosol and
gaseous constituents of the model atmosphere.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0290 (Other topics in mathematical methods in
physics); A9265V (Clouds, fog, haze, aerosols, effects
of pollution)",
classification = "657; 804; 921",
corpsource = "IBM Palo Alto Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerosol refractive; aerosol size frequency
distribution; aerosols; altitude km 0002; cloudless
plane parallel atmosphere; computer; digital
simulation; Gauss Seidel iteration; heating; index;
lower troposphere; mathematical techniques; medium
wavelength; no scattering; primary; radiative transfer;
radiative transfer equation; scattering; shortwave flux
divergence; simulation; solar radiation; solar
radiative heating; solar zenith angle; troposphere",
treatment = "T Theoretical or Mathematical",
}
@Article{Nussbaumer:1978:CCD,
author = "H. J. Nussbaumer and P. Quandalle",
title = "Computation of convolutions and discrete {Fourier}
transforms by polynomial transforms",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "134--144",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D15 (65T05)",
MRnumber = "57 \#10997",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The calculation of two-dimensional digital
convolutions has many applications, particularly in
image processing. The main problem associated with
these convolutions relates to processing load required
for their computation. In this article discrete
transforms are introduced and defined in a ring of
polynomials. These polynomial transforms are shown to
have the convolution property and can be computed in
ordinary arithmetic, without multiplications.
Polynomial transforms are particularly well suited for
computing discrete two-dimensional convolutions with a
minimum number of operations. Efficient algorithms for
computing one-dimensional convolutions and Discrete
Fourier Transforms are then derived from polynomial
transforms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0230 (Integral transforms); B0290Z (Other numerical
methods)C1130 (Integral transforms); C4190 (Other
numerical methods)",
classification = "723; 741; 921",
corpsource = "Compagnie IBM France, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "convolutions; discrete Fourier transforms; discrete
two dimensional; efficient algorithms; Fourier
transforms; image processing; mathematical
transformations --- Fourier Transforms; one
dimensional; ordinary arithmetic; polynomial;
polynomials; transforms",
reviewer = "Y. L. Luke",
treatment = "T Theoretical or Mathematical",
}
@Article{Lafuente:1978:LFP,
author = "J. M. Lafuente and D. Gries",
title = "Language Facilities for Programming User-Computer
Dialogues",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "145--158",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Extensions to PASCAL that provide for programming
man-computer dialogues are proposed. An interactive
application program is viewed as a sequence of frames,
representing stages of dialogue activity, and separate
computational steps. First, extensions are presented to
allow the description of the items of information
contained in each frame. Second, PASCAL is extended to
allow the inclusion of behavior rules for a frame to
specify the interactive dialogue. The behavior rules
are specified nonprocedurally. Previously, programming
such dialogues has required the specification of all
possible interactions and their effects in a procedural
fashion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6140D (High
level languages)",
classification = "723",
corpsource = "IBM Systems Products Div. Lab., Poughkeepsie, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "behaviour rules; computer programming languages;
dialogue activity; frames; interactive dialogue;
interactive systems; language facility; man computer
dialogue programming; Pascal; programming; separate
computational; steps; user computer dialogues",
treatment = "P Practical",
}
@Article{Hohl:1978:VPS,
author = "J. H. Hohl",
title = "Variational Principles for Semiconductor Device
Modeling with Finite Elements",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "159--167",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Variational principles related to three areas of
semiconductor device modeling by the finite element
method are presented. Some subtle points which are
crucial to the successful application of the method are
explored. It is suggested that the validity of the
selected variational formulations must be carefully
ensured, and that the physics disciplines provide the
best guidance for the right selections.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits)",
classification = "714; 921",
corpsource = "IBM General Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "device modelling; finite element analysis; finite
element method; finite elements modeling; mathematical
techniques --- Variational Techniques; semiconductor;
semiconductor device models; semiconductor devices;
variational principles; variational techniques",
treatment = "T Theoretical or Mathematical",
xxtitle = "Variational principles for semiconductor device
modelling with finite elements",
}
@Article{Dimsdale:1978:CCS,
author = "B. Dimsdale",
title = "Convex cubic splines",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "168--178",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D05",
MRnumber = "58 \#13617",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "383.41007",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4130 (Interpolation and function approximation)",
corpsource = "IBM Data Processing Div., Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "convex cubic splines; first derivative continuity;
large finite; slope case; spline segments; splines
(mathematics)",
reviewer = "J. G. Herriot",
treatment = "T Theoretical or Mathematical",
}
@Article{Bogy:1978:SAS,
author = "D. B. Bogy and F. E. Talke",
title = "Steady Axisymmetric Solutions for Pressurized Rotating
Flexible Disk Packs",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "179--184",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Steady solutions are obtained for undisturbed
pressurized flexible disk packs of various
configurations. Simplified fluid equations of motion
are coupled with the equations governing the deflection
of flexible membranes in order to arrive at the
differential equations for the spacing between the
disks of the pack. A simple asymptotic-solution formula
is derived for computing the dependence of the spacing
between two neighboring disks on air density and
viscosity, the volume rate of flow of air between the
two disks, the angular speed of rotation, and the
radial position on the disks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
classification = "408; 721; 722",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air density; asymptotic solution formula; axisymmetric
solutions; data storage, magnetic; differential
equations; disk packs; flexible disk rotating; flexible
membranes; flow; magnetic disc and drum storage;
membranes; pressurised flexible disc packs; rate;
steady; undisturbed; undisturbed pressurized flexible
disk packs; viscosity",
treatment = "T Theoretical or Mathematical",
}
@Article{Fernandez:1978:ERA,
author = "E. B. Fern{\'a}ndez and T. Lang and C. Wood",
title = "Effect of Replacement Algorithms on a Paged Buffer
Database System",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "185--196",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A50",
MRnumber = "57 \#8220",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a database system a buffer may be used to hold
recently referenced pages. If this buffer is in virtual
memory, the database paging system and the memory
paging system affect its performance. The study of the
effect of main memory replacement algorithms on the
number of main memory page faults is the basic
objective of this paper. It is assumed that the buffer
replacement algorithm is least recently used (LRU), and
page fault rates for LRU, random (R), and generalized
least recently used (GLRU) main memory replacement
algorithms are calculated and compared. A set of
experiments validates these fault rate expressions and
establishes some conditions for the practical
application of the results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160 (Database management
systems (DBMS))",
classification = "723",
corpsource = "IBM Sci. Center, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "buffer replacement algorithm; data base paging system;
data base systems; database management systems; fault
rate expressions; main; main memory page faults; memory
paging system; memory replacement algorithms; paged
buffer database system; referenced pages; replacement
algorithms; virtual memory; virtual storage",
reviewer = "Leon Levy",
treatment = "T Theoretical or Mathematical",
}
@Article{Easton:1978:MDR,
author = "M. C. Easton",
title = "Model for Database Reference Strings Based on Behavior
of Reference Clusters",
journal = j-IBM-JRD,
volume = "22",
number = "2",
pages = "197--202",
month = mar,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68H05 (68B15)",
MRnumber = "80b:68117",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The observation that references to a particular page
are clustered (in time) in typical database reference
strings is used as the intuitive motivation for a model
of page reference activity in an interactive database
system. The model leads to a two-parameter form for the
(Denning) working-set functions associated with a page.
Methods for estimating parameter values from
measurements or from logical descriptions of
applications are discussed. Results from the model are
shown to agree well with measurements from two database
systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160 (Database management
systems (DBMS))",
classification = "723; 921; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data base systems; data storage; database management
systems; database reference strings; Denning;
interactive database system; interactive systems; page;
probability; reference activity; reference clusters;
storage; virtual; working set functions two parameter
form",
treatment = "T Theoretical or Mathematical",
xxtitle = "Model for database reference strings based on
behaviour of reference clusters",
}
@Article{Bauschlicher:1978:MSC,
author = "Charles W. {Bauschlicher, Jr.} and Paul S. Bagus and
Henry F. {Schaefer III}",
title = "Model Study in Chemisorption: Molecular Orbital
Cluster Theory for Atomic Hydrogen on {Be(0001)}",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "213--234 (or 470--484??)",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The interaction between atomic hydrogen and the (0001)
surface of Be has been studied by using clusters of Be
atoms to simulate the substrate. The largest cluster
used contains 22 Be atoms, 14 in the first layer and 8
in a second layer. An H atom is added to the Be
clusters at four high symmetry adsorption sites. Ab
initio molecular orbital Hartree--Fock wave functions
have been obtained and the interaction energy of H with
the Be cluster is studied as a function of vertical
distance from the surface. Thorough studies of various
aspects of the computations and of the appropriate
interpretation of the cluster results are reported. The
authors' results show that three of the sites
considered have similar binding energies, D$_e$
approximately equals 50 kcal\slash mol (approximately
equals 2.1 multiplied by 10**5J\slash mol), and
(vertical) equilibrium distances from the surface,
r$_e$ approximately equals 0.1 nm. For the fourth site,
H directly over a Be atom, D$_e$ is approximately
equals 30 kcal\slash mol (1.3 multiplied by
10**5J\slash mol), and r$_e$ is approximately equals
0.14 nm.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3120E (Ab initio LCAO and GO SCF calculations (atoms
and molecules)); A3640 (Atomic and molecular clusters);
A6845 (Solid-fluid interface processes); A7320H
(Surface impurity and defect levels; energy levels of
adsorbed species); A8265M (Sorption and accommodation
coefficients (surface chemistry))",
classification = "542; 549; 722; 723; 802; 921",
corpsource = "NASA, Hampton, VA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "ab initio calculations; ab initio SCF calculations;
Applications; Be cluster; beryllium; beryllium and
alloys --- Surfaces; binding energies; calculations;
chemisorption; Codes, Symbolic; Coding Architecture;
Data Storage, Magnetic--Disk; energies; energy; Error
Control Coding; Error Rate Performance; H; hydrogen;
interaction; Magnetic Disk Storage Products; molecular
clusters; molecular orbital Hartree Fock wave
functions; molecular orbitals; Multiple Burst Errors;
neutral atoms; SCF calculations; Two-Level Coding;
vibrational",
treatment = "T Theoretical or Mathematical",
}
@Article{Brundle:1978:CPL,
author = "Christopher R. Brundle",
title = "Core-Level Photoemission and {LEED} Studies of
Adsorption at {Fe} Surfaces: Comparison between {CO}
and {O}$_2$",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "235--249",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Carbon monoxide and oxygen interactions with alpha
Fe(100) and polycrystalline surfaces have been studied
by x-ray photoemission (XPS or ESCA) and low energy
electron diffraction (LEED) at temperatures between 123
K and 473 K. For CO, the XPS results demonstrate the
existence of four electronically distinct CO adsorption
states; one is dissociative and three are molecular.
The binding energy analyses are consistent with one of
the latter molecular adsorption states, formed on the
polycrystalline surface, having a stretched CO bond
compared with the equivalent state on the Fe(100)
surface. For oxygen, only dissociative chemisorption is
observed, even at 123 K. Assuming monolayer coverage at
saturation allows calibration of the coverage for all
other situations of CO and O$_2$ adsorption. It is
demonstrated that at coverages of just greater than a
monolayer (293 K adsorption), Fe oxide species are
already present and that Fe**I**I**I dominates.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3365F (X-ray photoelectron spectra of molecules);
A6845 (Solid-fluid interface processes); A7960G
(Photoelectron spectra of composite surfaces); A8265M
(Sorption and accommodation coefficients (surface
chemistry))",
classification = "545; 701; 802; 804; 931; 932",
corpsource = "Res. Div. Lab., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "123K; 473K; adsorption; alpha Fe(100); carbon
compounds; carbon monoxide --- Adsorption;
chemisorption; CO; core level photoemission;
diffraction; dissociative chemisorption; electrons ---
Diffraction; ESCA; Fe surface; iron; iron and alloys;
LEED; low energy electron; low energy electron
diffraction; molecular adsorption states; monolayer
coverage; O/sub 2/; oxygen; oxygen --- Adsorption;
photoemission; polycrystalline surfaces; X-ray
photoelectron spectra; XPS",
treatment = "X Experimental",
}
@Article{Pandey:1978:RAH,
author = "Kosal Chandra Pandey",
title = "Reaction of Atomic Hydrogen with {Si(111)} Surfaces:
Formation of Monohydride and Trihydride Phases",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "250--259",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "By using a realistic tight-binding or LCAO (linear
combination of atomic orbitals) model, detailed
calculations of surface states, local densities of
states, and theoretically simulated photoemission
spectra have been carried out for two qualitatively
distinct structural models for chemisorption of atomic
hydrogen on Si(111)1 multiplied by 1 surfaces. In the
low-coverage model, called the monohydride phase or
Si(111):H, it is assumed that a single hydrogen atom
sits on top of each surface Si atom, thus saturating
all dangling bonds. In the high-coverage model,
designated as the trihydride phase or Si(111):SiH$_3$,
SiH$_3$ radicals are bonded to the surface Si atoms.
Due to the radically different atomic structures, the
theoretical spectra of the two phases show striking
differences. A comparison of the theoretical spectra
with the ultraviolet photoemission spectra taken during
hydrogen chemisorption on the quenched Si(111)1
multiplied by 1 surface clearly shows that at low
coverages the monohydride is formed. while at high
coverages the trihydride phase is formed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6845 (Solid-fluid interface processes); A7320H
(Surface impurity and defect levels; energy levels of
adsorbed species); A7960G (Photoelectron spectra of
composite surfaces); A8265J (Heterogeneous catalysis at
surfaces and other surface reactions)",
classification = "712; 804",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atomic hydrogen; calculations; chemisorption; electron
states; elemental; elemental semiconductors; high
coverage model; hydrogen; hydrogen --- Adsorption;
LCAO; local densities of states; low coverate; model;
monohydride phase; photoelectron spectra;
semiconducting silicon; semiconductors; Si(111)1 x 1;
Si(111):H; Si(111):SiH/sub 3/; silicon; spectra;
surface; surface electron states; surface states;
surface structure; surfaces; theoretical; tight-binding
calculations; trihydride phase; ultraviolet
photoemission spectra",
treatment = "T Theoretical or Mathematical",
}
@Article{Winters:1978:CEW,
author = "Harold F. Winters",
title = "Chemisorption of Ethane on {W}(111)",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "260--264",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Ethane is chemisorbed on W(111) with a sticking
probability of approximately equals 0.003. The carbon
Auger spectrum at saturation coverage exhibits a
two-peak structure similar to that for graphite, while
the being approximately equals (low energy electron
diffraction) pattern is almost identical to that
obtained for an atomically clean surface. Heating
surface to approximately equals 773 K causes desorption
of hydrogen and changes the carbon Auger spectrum to a
three-peak structure similar to that for tungsten
carbide. After annealing, the LEED pattern is affected
in different ways depending on the precise conditions,
but it may in certain circumstances almost disappear.
Exposure to ethylene produces a similar sequence of
events. A large kinetic isotope effect is observed with
the ratio of the sticking probabilities left bracket
S(C$_2$H$_6$)/S(C$_2$D$_6$), W(111), T equals 300 K
right bracket being approximately equals 3. A similar
ratio is measured for tungsten at T equals 2500 K.
These data suggest that chemisorption is dissociative
in nature, probably involving the reaction C$_2$H$_6$
yields C$_2$H$_5$* plus H yields subsequent steps.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6845 (Solid-fluid interface processes); A7920F
(Electron-surface impact: Auger emission); A8265J
(Heterogeneous catalysis at surfaces and other surface
reactions)",
classification = "543; 802; 804",
corpsource = "Res. Div. Lab., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealing; Auger effect; Auger spectrum;
chemisorption; diffraction; dissociative chemisorption;
ethane; hydrogen atom; kinetic isotope effect; LEED;
low energy electron; low energy electron diffraction;
organic compounds; tungsten; tungsten and alloys ---
Surfaces; tunnelling; W(111)",
treatment = "X Experimental",
}
@Article{Demuth:1978:MGA,
author = "Joseph E. Demuth",
title = "Molecular Geometries of Acetylene and Ethylene
Chemisorbed on {Cu}, {Ni}, {Pd}, and {Pt} Surfaces",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "265--276",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Ultraviolet photoemission measurements of the valence
orbital electronic structure of acetylene and ethylene
chemisorbed on Cu(100) or Cu(111), Ni(111), Pd(111),
and Pt(111) are presented. A comparison is made of the
measured energy levels of these chemisorbed species to
those of the free molecule and use a similar comparison
of the relative changes in ground state energy levels
of distorted free molecules calculated with a SCF-LCAO
(Self Consistent Field --- Linear Combination of Atomic
Orbitals) method to determine the molecular geometries
of these chemisorbed species. The limitations and
accuracies of such an approach are discussed. From the
determined geometries the authors identify two trends
in the structure of these chemisorbed molecules on
these surfaces: first, increasingly greater molecular
distortions occur with increasing atomic number of the
substrate atom, and secondly, greater molecular
disortions occur for ethylene than for acetylene on the
same metal.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3120E (Ab initio LCAO and GO SCF calculations (atoms
and molecules)); A3365C (UV and VUV photoelectron
spectra of molecules); A3520B (General molecular
conformation and symmetry; stereochemistry); A6845
(Solid-fluid interface processes); A7320H (Surface
impurity and defect levels; energy levels of adsorbed
species); A7960G (Photoelectron spectra of composite
surfaces)",
classification = "544; 547; 548; 802; 804",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acetylene; atomic number; chemisorption;
configurations; copper and alloys --- Surfaces;
Cu(100); Cu(111); distortions; energy levels; ethylene;
ethylene --- Adsorption; ground state energy levels;
LCAO; molecular; molecular geometry; Ni(111); nickel
and alloys --- Surfaces; organic compounds; organic
molecule; organic molecule configurations; palladium
and alloys --- Surfaces; Pd(111); photoelectron
spectra; pi-d bonding interaction; platinum and alloys
--- Surfaces; Pt(111); SCF; transition metals;
ultraviolet photoemission measurement; valence orbital
electronic structure",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Chuang:1978:SPT,
author = "Tung J. Chuang and Klaus R. Wandelt",
title = "Sputter Profiling through {Ni\slash Fe} Interfaces by
{Auger} Electron Spectroscopy",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "277--284",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Sputter characteristics of nickel-iron systems in the
form of layer interfaces and bulk alloy films have been
studied by Auger electron spectroscopy. The sputter
rates for pure nickel and iron and their alloys have
been determined and are independent (within 10\%) of
the grain size and film composition. The various
factors that contribute to the broadening of depth
profiles have been examined. The initial broadening of
4.5 nm at zero overlayer thickness is mainly attributed
to the effects of electron escape depth and
compositional mixing due to ion bombardment. For thin
films, the depth-dependent broadening induced by
sputter damage has an approximately exponential
dependence on the overlayer thickness. For thick films,
this broadening induced by sputter damage has an
approximately exponential dependence on the overlayer
thickness. For thick films, this broadening is
estimated to be about 10\% of the sputter distance. The
effect of ion-induced surface compositional mixing as a
function of incident Ar** plus ion energy has been
studied by taking advantage of the different sampling
depths of low and high energy Auger electrons.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180J (Ion beam effects); A6848 (Solid-solid
interfaces); A7920F (Electron-surface impact: Auger
emission); A7920N (Atom-, molecule-, and ion-surface
impact)",
classification = "539; 545; 548; 801",
corpsource = "Res. Div. Lab., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Ar/sup +/ ion energy; Auger effect; Auger electron;
bulk alloy films; depth profiles; interface; interface
structure; ion bombardment; ion-surface impact; iron;
iron and alloys; layer interfaces; Ni-Fe; nickel;
nickel and alloys; nickel iron alloys --- Thin Films;
reactive sputtering; spectroscopy; spectroscopy, Auger
electron; sputter damage; sputter profiling;
sputtering; thick films; thin films",
treatment = "X Experimental",
}
@Article{Young:1978:CET,
author = "Donald R. Young and Donelli J. DiMaria and William R.
Hunter and Carlos M. Serrano",
title = "Characterization of Electron Traps in
Aluminum-Implanted {SiO}$_2$",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "285--288",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "N. M. Johnson, W. C. Johnson, and M. A. Lampert have
studied the effect of Al implantation on the trapping
behavior of SiO$_2$. The large fluence that they used
(1 multiplied by 10**1**4Al\slash cm**2) and the low
annealing temperatures (up to 600 degree C) resulted in
a trapping efficiency of 1 and made it impossible to
characterize the traps. In the present study a lower
fluence and higher annealing temperatures to reduce the
trapping efficiency are used to permit characterization
of the traps. The predominant trap cross sections are
1.26 multiplied by 10** minus **1**6 and 1.40
multiplied by 10** minus **1**7 cm**2.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170T (Doping and implantation of impurities); A7340Q
(Metal-insulator-semiconductor structures); B2530F
(Metal-insulator-semiconductor structures)",
classification = "482; 708",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al implantation; aluminium; annealing; dielectric
materials; electron; electron traps; insulating thin
films; ion implantation; metal insulator semiconductor;
metal-insulator-semiconductor structures; silica;
silicon compounds; SiO/sub 2/ film; structure; trap
cross sections; traps",
treatment = "X Experimental",
}
@Article{DiMaria:1978:LTC,
author = "Donelli J. DiMaria and Donald R. Young and William R.
Hunter and Carlos M. Serrano",
title = "Location of Trapped Charge in Aluminum-Implanted
{SiO}$_2$",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "289--293",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The position of the centroid of electrons trapped on
sites resulting from aluminum implantation into SiO$_2$
is measured by using the photo I-V technique for
energies from 15-40 keV, oxide thicknesses from 49-140
nm, and post-implant annealing temperatures from
600-1050 degree C in N$_2$ for 30 min. The centroid of
the trapped electrons is found to be identical to that
of the implanted aluminum for SIMS measurements,
regardless of annealing temperature from 600 to 1050
degree C, and located closer (by less than 9 nm) to the
Al-SiO$_2$, interface than predicted from the
Lindhard-Scharff-Schott (LSS) calculations of J. F.
Gibbons, W. S. Johnson, and S. W. Mylroie. Comparison
of centroids determined from photo I-V and SIMS
measurements as a function of SiO$_2$ thickness also
implies that the distributions of the ions and negative
trapped charge are the same.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170T (Doping and implantation of impurities); A7240
(Photoconduction and photovoltaic effects;
photodielectric effects); A7340Q
(Metal-insulator-semiconductor structures); B2530F
(Metal-insulator-semiconductor structures)",
classification = "482; 708",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "600-1050 degrees C; Al implantation; aluminium;
annealing; centroid of trapped; compounds; dielectric
materials; electron traps; electrons; film; ion
implantation; metal-insulator-; MOS; photoconductivity;
photocurrent; secondary ion mass spectroscopy;
semiconductor structures; silica; silicon; SIMS;
SiO/sub 2/",
treatment = "X Experimental",
}
@Article{Raider:1978:XPS,
author = "Stanley I. Raider and Richard Flitsch",
title = "{X}-ray Photoelectron Spectroscopy of {SiO$_2$-Si}
Interfacial Regions: Ultrathin Oxide Films",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "294--303",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The composition and width of the interfacial region
formed between this thermally-grown oxide films and
single-crystal Si substrates were nondestructively
characterized by means of x-ray photoelectron
spectroscopy. Data obtained from variations in
core-level binding energies, from variation in
photoelectron line intensities, and from variations in
photoelectron linewidths indicate the presence of a
nonstoichiometric oxide-Si transition region. The
composition and width of this region are dependent upon
substrate orientation, but are invariant with change in
other oxidation processing parameters. Transition
regions formed on 100 direction oriented substrates are
narrower and more completely oxidized than those formed
on 111 direction oriented substrates. Although both
Si-Si bonds and SiO-Si groups are present in this
nonstoichiometric region, they do not appear to be a
mixture of Si and SiO$_2$. Instead, a continuous
distribution of Si tetrahedra, Si-(O)$_x$(Si)$_{4-x}$,
are formed, in which $x$ changes from $0$ to $4$ as one
proceeds from the substrate to the stoichiometric
SiO$_2$ film.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6848 (Solid-solid interfaces); A6855 (Thin film
growth, structure, and epitaxy); A7340Q
(Metal-insulator-semiconductor structures); A7960E
(Photoelectron spectra of semiconductors and
insulators); B2530F (Metal-insulator-semiconductor
structures)",
classification = "482; 708; 712; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "composition; compounds; core level binding energies;
dielectric materials --- Thin Films; elemental
semiconductors; films --- Dielectric; interface
structure; interfacial region; linewidths; oxidation;
photoelectron; photoelectron line intensities;
semiconducting silicon; semiconductor devices;
semiconductor insulator boundaries;
semiconductor-insulator boundaries; silica --- Thin
Films; silicon; SiO/sub 2/-Si interface; spectroscopy;
transition region; ultrathin oxide regions; width;
X-ray photoelectron; X-ray photoelectron spectra",
treatment = "X Experimental",
}
@Article{Ludeke:1978:EPS,
author = "Rudolf Ludeke",
title = "Electronic Properties of (100) Surfaces of {GaSb} and
{InAs} and their Alloys with {GaAs}",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "304--314",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Smooth, monocrystalline (100) surfaces of the alloys
In$_{1-x}$Ga$_x$As and GaSb$_{1-y}$As$_y$ were prepared
by molecular beam epitaxy. Both As-stabilized c(2
multiplied by 8) and metal-stabilized c(8 multiplied by
2) surface reconstructions were observed for
In$_{1-x}$Ga$_x$As over the entire alloy range.
GaSb$_{1-y}$As$_y$ exhibited a c(2 multiplied by 6) or
(2 multiplied by 3) structure for y approximately less
than 0.2, and, after a transition region, the
anion-stabilized c(2 multiplied by 8) or the
Ga-stabilized c(8 multiplied by 2) structures for y
approximately greater than 0.5. Electron energy loss
spectroscopy revealed the simultaneous presence of two
empty, dangling-bond-derived surface states in both
alloy systems. For In$_{1-x}$Ga$_x$As the In-derived
empty surface state lies approximately equals 0.4-0.5
eV below that of Ga and moves from above the conduction
band edge into the band gap for approximately greater
than 0.6. The overlap between the Ga-and In-derived
empty surface states causes the quenching of the Ga(3d)
surface exciton. For GaSb$_{1-y}$As$_y$ the Sb dangling
bonds generate an empty, localized surface state which
lies 0.2-0.3 eV above the empty, Ga-derived surface
state. Both levels lie above the conduction band edge
throughout the alloy range.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7320 (Electronic surface states); A7920K (Other
electron-surface impact phenomena); B2520D (II-VI and
III-V semiconductors)",
classification = "712",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "anion stabilisation; As; compounds; electron energy
loss; electron energy loss spectra; electron states;
electron surface states; Ga stabilisation; gallium;
gallium antimonide; gallium arsenide; GaSb/sub
1-y/As/sub y/; III-V semiconductors; In/sub 1-x/Ga/sub
x/As; indium arsenide; indium compounds; metal
stabilisation; molecular beam epitaxy; monocrystalline
(100) surfaces; semiconducting gallium compounds;
semiconducting indium compounds; semiconductor alloys;
spectra; stabilisation; surface",
treatment = "X Experimental",
}
@Article{Simonyi:1978:OEF,
author = "Eva E. Simonyi and Josef F. Graczyk and Jerry B.
Torrance",
title = "Oriented epitaxial films of ({NMP}) ({TCNQ})",
journal = j-IBM-JRD,
volume = "22",
number = "3",
pages = "315--320",
month = may,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An important step in the characterization or organic
conductors is the ability to correlate the solid state
electrical properties of these materials with their
composition and crystal structure. In many cases it has
not been possible to grow single crystals of suitable
size or purity for such investigations. The use of
epitaxial films represents an alternative approach. In
addition, such films may be potentially useful as
larger area conductive surfaces. This paper describes
the preparation of relatively large-area, oriented
epitaxial films of the organic conductor
N-methylphenazinium-7,7,8,8-tetracyanoquinodimethanide
(NMP) (TCNQ) by means of vacuum evaporation. Factors
that appear to affect the degree of orientation, the
film areas, and the chemical composition include the
source temperature, the kind of evaporation (rapid or
slow), the degree of lattice matching between the
substrate and the organic material, and the substrate
surface charge potential.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A8110B (Crystal growth from vapour); A8115G (Vacuum
deposition); B0510D (Epitaxial growth)",
classification = "712",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chemical composition; compounds; epitaxial layers;
evaporation; lattice matching;
methylphenazinium-7,7,8,8-tetracyanoquinodimethanide;
N-; NMP-TCNQ; one-dimensional conductivity; organic;
organic compounds; organic conductor; orientation;
oriented epitaxial films; potential; semiconducting
films; semiconducting organic compounds; source;
substrate surface charge; temperature; vacuum; vapour
phase epitaxial growth",
treatment = "P Practical; X Experimental",
}
@Article{Schwuttke:1978:LCS,
author = "Guenter H. Schwuttke and Ted F. Ciszek and Kuei H.
Yang and Alexander Kran",
title = "Low Cost Silicon for Solar Energy Conversion
Applications",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "335--345",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Economically viable means of producing silicon solar
cells for the conversion of solar energy into electric
power are discussed. Emphasis is given to the
discussion of crystal growth techniques capable of
growing single-crystal silicon ribbons directly and
inexpensively from molten silicon. The capillary action
shaping technique (CAST) recently developed by IBM has
a good potential for producing low cost silicon sheets
suitable for solar cells. This technique has produced
ribbon 100 mm wide and 0.3 mm thick. Problems that CAST
must overcome in order to supply material for low cost
solar cells are discussed. Economic and technological
computer-modeled comparisons indicate that continuously
grown CAST ribbons of these dimensions can meet a cost
objective below 50/m**2 of sheet material. The results
require that it be possible to fabricate a
twelve-percent-efficient solar cell from CAST ribbon
100 mm wide and 0.3 mm thick at a polycrystalline
silicon cost of 10\slash kg.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8110F (Crystal growth from melt); A8630J
(Photoelectric conversion; solar cells and arrays);
B0510 (Crystal growth); B8420 (Solar cells and
arrays)",
classification = "702; 712",
corpsource = "IBM, System Products Div., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "action shaping technique; capillary; cost; crystal
growth from melt; elemental semiconductors; molten Si;
ribbons; semiconducting silicon; semiconductor growth;
Si solar cell production; silicon; solar cells; solar
energy conversion",
treatment = "A Application; E Economic",
}
@Article{Blakeslee:1978:GPG,
author = "A. Eugene Blakeslee and Stanley M. Vernon",
title = "Growth of Polycrystalline {GaAs} for Solar Cell
Applications",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "346--352",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Films of polycrystalline GaAs have been grown on
foreign substrates by the metal-organic process. The
main objective was to produce films with as large a
grain size as possible, so that high-efficiency
photovoltaic devices may eventually be fabricated from
such thin film\slash substrate structures. At 973 K the
average grain size was less than 1 $\mu$ m, and was
unaffected by the choice of substrate. Increasing the
deposition temperature to 1123 K, while maintaining all
other conditions the same, resulted in grains as large
as 10 to 20 $\mu$ m in diameter. Grain sizes as large
as 10 $\mu$ m could be obtained by precoating the
substrates with thin films of evaporated gold or tin.
However, both of t methods gave films that were
discontinuous. A two-step procedure in which the films
were nucleated at 873 K prior to growth at 1123 K
yielded continuous films with an average grain size of
5 $\mu$ m. Schottky barrier solar cells fabricated from
these films exhibited short-circuit current densities
as high as 15.7 mA\slash cm**2, even though the highest
conversion efficiency (AM0, uncoated) was only 1.3
percent because of the low fill factor (0.28).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7240 (Photoconduction and photovoltaic effects;
photodielectric effects); A8115H (Chemical vapour
deposition)A8630J (Photoelectric conversion; solar
cells and arrays); B0520F (Vapour deposition); B4250
(Photoelectric devices); B8420 (Solar cells and
arrays)",
classification = "702; 712; 714; 741; 941",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chemical vapour deposition; circuit current density;
continuous films; conversion; efficiency; fill factor;
gallium arsenide; grain size; III-V semiconductors;
metal/organic process; photovoltaic cells; photovoltaic
devices; polycrystalline GaAs; Schottky barrier;
semiconducting gallium compounds; semiconductor;
semiconductor growth; short; short-circuit currents;
solar cell; solar cells; thin films",
treatment = "A Application",
}
@Article{Merritt:1978:OPM,
author = "Vingie Y. Merritt",
title = "Organic Photovoltaic Materials: Squarylium and
Cyanine-{TCNQ} Dyes",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "353--371",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The photovoltaic properties of Schottky barrier
sandwich cells consisting of sublimed and solution-cast
thin films of selected squarylium (bis-anilino
derivatives of cyclobuta-1,3-diene-2,4-dione) and
cyanine-tetracyanoquinodimethanide (TCNQ) dyes have
been measured. Amorphous solid solutions of 1.1 prime
-diethyl-2,2 prime -dicarbocyanine-and oxa-2,2 prime
-dicarbocyanine-TCNQ salts were also tested. The
effects of various material and device properties on
the performance of organic photovoltaic cells are
discussed, and it is proposed that organic solar cells
having efficiencies of one percent or more can be made
by using existing technologies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7240 (Photoconduction and photovoltaic effects;
photodielectric effects); A7330 (Surface double layers,
Schottky barriers, and work functions); A8630J
(Photoelectric conversion; solar cells and arrays);
B4210 (Photoconducting materials and properties); B4250
(Photoelectric devices); B8420 (Solar cells and
arrays)",
classification = "708; 712; 714; 741; 804; 941",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cells; cyanine/TCNQ dye; efficiencies; organic
compounds; organic photovoltaic cells; organic solar;
performance; photoconducting materials; photovoltaic;
photovoltaic cells; Schottky barrier sandwich cells;
Schottky effect; solar cells; squarylium; thin films",
treatment = "A Application; X Experimental",
}
@Article{Pettit:1978:SAS,
author = "G. David Pettit and Jerome J. Cuomo and Thomas H.
DiStefano and Jerry M. Woodall",
title = "Solar Absorbing Surfaces of Anodized Dendritic
Tungsten",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "372--377",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Anodization of textured tungsten is shown to have
merit either in creating a solar absorber of extremely
high absorptance when applied to a large dendritic
surface, or in enhancing the solar
absorptance-to-emittance ratio when applied to smaller
hillock topographies. The angular dependence of the
absorption is reduced by the anodization coating, which
consists of a thin conformal coating of WO$_3$. The
surface is stable up to temperatures of 520 K in air.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8630S (Photothermal conversion)",
classification = "539; 543; 657",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "angular dependence; anodisation; anodized dendritic
tungsten; conformal coating; dendritic; dendritic
structure; hillock topographies; solar absorber; solar
absorber-convertors; solar radiation; surface; thin;
tungsten; tungsten and alloys --- Anodic Oxidation",
treatment = "A Application",
}
@Article{Jurovics:1978:OAD,
author = "Steve A. Jurovics",
title = "Optimization Applied to the Design of an
Energy-Efficient Building",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "378--385",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "There are several public domain, and numerous
proprietary, computer programs that provide detailed
simulations of the heating and cooling requirements for
a building. Such programs are often used to evaluate
changes in the design of a building that are made to
decrease its energy requirements. A user is considered
to be working in a trial-and-error mode if each
execution of the program provides no formal guidance
for the next change. This work reports on an
investigation of the imbedding of such an energy
analysis program into an optimization structure. Such
an arrangement would enable a user to specify a set of
architectural and construction parameters and the
limits within which they might vary, and from this to
determine the parameters that yield a local minimum in
thermal load and the sensitivity of this load to
changes in these parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3330 (Control applications in building and civil
engineering); C7440 (Civil and mechanical engineering
computing)",
classification = "402; 901",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architectural CAD; architectural parameters;
buildings; construction parameters; energy analysis
program; energy efficient building design; limits;
optimisation; optimization structure; sensitivity;
sensitivity analysis; thermal load",
treatment = "A Application",
}
@Article{Kaneko:1978:CCP,
author = "Toyohisa Kaneko",
title = "Color Composite Pictures from Principal Axis
Components of Multispectral Scanner Data",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "386--392",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When principal axis transformations are applied to
multispectral scanner (MSS) data, the majority of data
variability is shown to be contained in the first two
or three components. A method is described for
generating a color composite picture from these
components whereby most of the information collected by
an MSS can be conveyed in a single color picture. The
first component is found to be a weighted sum of image
data from all channels, and therefore it is natural to
associate the first component with brightness. To be
consistent with this interpretation, only the first
component of the transformed data is used to control
the brightness of the color composite picture.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0768 (Photography, photographic instruments and
techniques); A4230V (Image processing and restoration);
A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B6140C
(Optical information, image and video signal
processing); B7710 (Geophysical techniques and
equipment)",
classification = "742",
corpsource = "IBM, Federal Systems Div., Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "brightness; colour composite; colour photography; data
conversion; data variability; multispectral scanner
data; picture; picture processing; principal axis
transformations; remote sensing; weighted sum",
treatment = "A Application",
}
@Article{West:1978:GTC,
author = "Colin H. West",
title = "General Technique for Communications Protocol
Validation",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "393--404",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A technique for the validation of protocols in
communications systems is described. It can be used for
systems composed of processes that can be modeled as
finite directed graphs. The validation exhaustively
exercises the interaction domain of a system and
identifies all occurrences of a number of well-defined
error conditions. The method can detect when individual
processes have no predefined response to incoming
messages, as well as system deadlocks and potential
loss of messages due to overflow conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210 (Telecommunication applications)",
classification = "723",
corpsource = "IBM, Zurich Res. Div. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "communications protocol validation; computers;
directed graphs; error conditions; error detection;
finite directed graphs; overflow conditions; system
deadlocks; telecommunication",
treatment = "P Practical",
}
@Article{Franaszek:1978:AVT,
author = "Peter A. Franaszek and Brian T. Bennett",
title = "Adaptive Variation of the Transfer Unit in a Storage
Hierarchy",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "405--412",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Consider a paged storage hierarchy with at least two
levels L$_1$ and L$_2$, where L$_1$ denotes main
storage and L$_2$ secondary storage. Suppose that the
unit of replacement for L$_1$ is a single page, and
that the L$_2$-to-L$_1$ transfer unit, given a page
fault, is an integer number of pages. Then, given a
suitable replacement policy for L$_1$, increasing the
unit of transfer often results in a lower miss ratio at
the expense of increased paging traffic. The
possibility is explored of adaptively varying the
L$_2$-to-L$_1$ transfer unit as a function of the
reference history of the data to be fetched.
Experiments on traces drawn from two large data base
systems suggested that such adaptation can result in
improved tradeoffs between miss ratios and paging
traffic.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adaptive variation; computer operating systems; main
storage; miss ratios; paged storage hierarchy; paging
traffic; reference history; secondary storage; storage
management; tradeoffs; transfer unit",
treatment = "P Practical",
}
@Article{Alfonseca:1978:MAI,
author = "Manuel Alfonseca and Maria L. Tavera",
title = "A machine-independent {APL} interpreter",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "413--421",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of writing machine-independent APL
interpreters is solved by means of a systems
programming approach making use of an intermediate
level language specially designed for that purpose. The
language, as well as the procedure used to build
universal interpreters, are described. Three compilers
that translate this language for three different
machines have been written so far, and an APL
interpreter has been finished.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "723",
corpsource = "IBM, Sci. Centre, Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL interpreter; compilers; computer operating
systems; intermediate level; language; procedure
oriented languages; program interpreters; systems
programming; universal interpreters",
treatment = "P Practical",
}
@Article{Lewis:1978:OPM,
author = "Sanford J. Lewis",
title = "Organic Photovoltaic Materials: Squarylium and
Cyanine-{TCNQ} Dyes",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "422--428",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The photovoltaic properties of Schottky barrier
sandwich cells consisting of sublimed and solution-cast
thin films of selected squarylium (bis-anilino
derivatives of cyclobuta-1,3-diene-2,4-dione) and
cyanine-tetracyanoquinodimethanide (TCNQ) dyes have
been measured. Amorphous solid solutions of 1,1 prime
-diethyl-2,2 prime -dicarbocyanine-and oxa,2,2 prime
-dicarbocyanine-TCNQ salts were also tested. The
effects of various material and device properties on
the performance of organic photovoltaic cells are
discussed, and it is proposed that organic solar cells
having efficiencies of one percent or more can be made
by using existing technologies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "531; 539; 712; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "films",
xxnote = "Check: page number overlap with
\cite{Lewis:1978:RML}.",
}
@Article{Lewis:1978:RML,
author = "S. J. Lewis",
title = "Regression model for {LPE} film property control",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "422--428",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A8110D (Crystal growth from solution); A8115L
(Deposition from liquid phases (melts and solutions));
B0510D (Epitaxial growth); C3120N (Thermal variables
control); C3355Z (Control applications in other
manufacturing processes)",
corpsource = "IBM, General Products Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "CaGe films; collapse field; compensating growth
strategies; depletion; epitaxial layers; feedback;
fluctuations in growth conditions; Ga films; liquid
phase epitaxial film; liquid phase epitaxial growth;
modelling; properties; real time feedback control
scheme; regression equations; temperature control",
treatment = "A Application; T Theoretical or Mathematical",
xxnote = "Check: page number overlap with
\cite{Lewis:1978:OPM}.",
}
@Article{Holmes:1978:RCN,
author = "W. N. Holmes",
title = "Representation for complex numbers",
journal = j-IBM-JRD,
volume = "22",
number = "4",
pages = "429--430",
month = jul,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5230 (Digital arithmetic methods)",
corpsource = "IBM Australia Ltd., Canberra, ACT, Australia",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complex number representation; feasibility; number
theory; real bases; single component scheme",
treatment = "T Theoretical or Mathematical",
}
@Article{Santisteban:1978:PCM,
author = "A. Santisteban and L. Munoz",
title = "Principal Components of a Multispectral Image:
Application to a Geological Problem",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "444--454",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The principal components of a multispectral image are
studied with special emphasis placed on
photointerpretation applications. The method used to
obtain these components involves a linear radiometric
enhancement which avoids artifact creation and does not
require extra computational work. The results have been
particularized to Landsat multispectral scanner images
and applied to the geological study of a sedimentary
basin in central Spain.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9165 (Geophysical aspects of geology and mineralogy);
A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B7710
(Geophysical techniques and equipment)",
classification = "405; 481; 742",
corpsource = "Madrid Sci. Center, IBM, Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "geology; geophysical techniques; Landsat; linear
radiometric enhancement; multispectral remote;
multispectral scanner images; photointerpretation;
remote sensing; sedimentary basin; sensor; Spain",
treatment = "A Application; P Practical",
}
@Article{Hernandez:1978:MPR,
author = "V. M. Hernandez and M. A. Flores",
title = "Machine Processing of Remotely Sensed Data: Three
Applications in {Mexico}",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "455--463",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In general, ground-data acquisition procedures in
developing countries are not very efficient, and the
resulting lack of reliable data produces significant
delays in important management-planning decision. A
description is given of three studies involving
different applications of machine processing of
remotely sensed data, a recent technology that appears
to have potential use for timely ground-information
acquisition. The general methodology describes the use
of a special software processing system. Finally, some
conclusions are presented relating to the specific
problems discussed and to the advantages of remote
sensing in general.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8670L (Measurement techniques and instrumentation in
environmental science); A9365 (Data and information;
acquisition, processing, storage and dissemination in
geophysics); C7340 (Geophysics computing); C7890 (Other
special applications of computing)",
classification = "405; 723; 742",
corpsource = "Mexico Sci. Center, IBM, Mexico City, Mexico",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computing; crop area evaluation; data acquisition;
data processing; data reduction and analysis;
developing countries; erosion; erosion zones;
geography; geophysics; geophysics computing; land use
mapping; Mexico; natural resources; remote; remote
sensing; sensing; water resources monitoring",
treatment = "A Application; P Practical",
xxauthor = "M. {Hernandez V.} and A. {Flores M.}",
}
@Article{Todini:1978:UDC,
author = "E. Todini",
title = "Using a Desk-Top Computer for an On-Line Flood Warning
System",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "464--471",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Consideration of the development of an adaptive model
that is applicable to real-time forecasting of
hydrologic processes. The rainfall-runoff process is
considered here. In this model the discharge was
modeled as autoregressive with past discharges and a
moving average representation on the precipitation. The
model makes use of the Constrained Linear Systems (CLS)
technique to split the precipitation into two rainfall
inputs by using a threshold based on an antecedent
precipitation index. This technique can be thought of
as a piecewise linearization of a nonlinear process.
The real-time forecasting model is a time invariant
linear state model where the state variables, discharge
and rainfall, are estimated by the Kalman filtering
algorithm and the unknown model parameters by using the
instrumental variables approach. This technique is
applied in a case study using data from the Ombrone
River Basin, Italy, and was implemented on a small
desk-top computer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9240F (Rivers, runoff, and streamflow); A9385
(Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); C1290B
(Systems theory applications in natural resources and
ecology); C7340 (Geophysics computing); C7890 (Other
special applications of computing)",
classification = "442; 723",
corpsource = "Italy Sci. Center, IBM, Pisa, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adaptive model; computers, miniature --- Applications;
computing; constrained linear; filtering and prediction
theory; flood warning system; floods; hydrologic
processes; hydrological techniques; hydrology; Italy;
Kalman filtering algorithm; Kalman filters;
meteorology; Ombrone River Basin; piecewise linear
system; piecewise-linear techniques; precipitation
index; rainfall; rainfall runoff process; real; rivers;
safety systems; system; time forecasting; time
invariant linear state model",
treatment = "A Application; P Practical",
}
@Article{Sguazzero:1978:HNM,
author = "P. Sguazzero and C. Chignoli and R. Rabagliati and G.
Volpi",
title = "Hydrodynamic Numeric Modeling of the {Lagoon of
Venice}",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "472--480",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Description of two hydrodynamic numeric models and
their application to the Lagoon of Venice, Italy. The
models are based on the same mesh, bottom topography,
boundary conditions, and spatial distribution of the
bottom friction coefficient (Chezy coefficient).
Although quite different in structure, both models
ultimately provide sea level fluctuation and current
speed at each mesh-point as functions of time. The
first model numerically integrates the time-dependent,
nonlinear, hyperbolic shallow water equations, written
in conservation form, with a space-staggered
leapfrog-type (time dense) scheme. The model is suited
to episode simulation and is a particularly useful tool
for system management and control. The second model is
suited to long-term simulations and models only the
astronomic tide; it solves a hybrid
(differential-algebraic) system resulting from
semilinearization of the shallow water equations under
harmonic assumptions for the tide.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9210H (Surface waves, tides, and sea level); A9210S
(Coastal and estuarine oceanography); A9330G (Europe);
A9330R (Regional seas); C4170 (Differential equations);
C7340 (Geophysics computing)",
classification = "471; 631",
corpsource = "Italy Sci. Center, IBM, Venice, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "astronomic; Chezy; computing; differential equations;
digital simulation; equations; geophysics computing;
hydrodynamic numerical models; hydrodynamics;
nonlinear; nonlinear hyperbolic equations;
oceanography; parameter; partial differential; sea
level fluctuation; semilinearization; shallow water
equations; spatial distribution; tidal basins; tidal
dynamics; tide; tides",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Gazdag:1978:ESW,
author = "J. Gazdag",
title = "Extrapolation of Seismic Waveforms by {Fourier}
Methods",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "481--486",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of constructing a cross section of
reflectivity from the wave field recorded at the
surface of the medium is discussed with particular
reference to migration of seismic records. The
numerical procedures are formulated in the frequency
and wavenumber domain. The operations are defined in a
fixed coordinate system, whereas finite difference
methods require a downward-moving reference frame. The
numerical algorithms in the frequency wavenumber domain
are simpler and give more accurate results than finite
difference methods. This is particularly true when the
lateral velocity variation in the medium can be
neglected. In this case the downward wave extrapolation
is accomplished by implementing a phase change in the
Fourier coefficients. Numerically, this is equivalent
to a multiplication by a complex number of unit
modulus. There is no stability condition associated
with this operation. This means that the source and
recorder positions can be lowered by any amount within
one computational step.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9130F (Seismic waves); A9385 (Instrumentation and
techniques for geophysical, hydrospheric and lower
atmosphere research); C4190 (Other numerical methods);
C7340 (Geophysics computing)",
classification = "484",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computing; cross section of reflectivity; data
reduction and analysis; downward wave extrapolation;
fast Fourier transforms; finite difference methods;
fixed coordinate system; Fourier analysis; Fourier
transforms; frequency wavenumber domain; geophysical
techniques; geophysics; geophysics computing; migration
of seismic records; numerical methods; seismic
waveforms extrapolation; seismic waves",
treatment = "A Application",
}
@Article{Low:1978:DWD,
author = "D. W. Low",
title = "A Directed Weather Data Filter",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "487--497",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is important to reduce the computational burden of
energy-analysis computer programs (such as those that
compute expected heating and cooling loads and the
energy required to meet these loads) since the input
may include, for example, hourly measurements of
several weather variables over periods of time of up to
ten years. It is possible to generate a small set of
weather data to represent a larger, more comprehensive
set by using computer programs called weather data
filters. However, existing filters that are generally
able to preserve statistical properties of the original
data offer no a priori method for controlling or even
estimating the errors they introduce in the output of
the energy analysis programs. A description is given of
a weather filter that preserves the ``energy content''
of the data; i.e., given a particular building design
and usage schedule, this filter generates a small set
of weather data which, when properly weighted, produces
the same total heating and cooling loads as the
original data. Because the error caused by using the
filtered weather data falls well within acceptable
bounds even when changes are made in the building
design, the filter described allows the designer to
test a large number of design or retrofit alternatives
for energy efficiency at very low computational cost.
5",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering computing)",
classification = "402; 723; 901",
corpsource = "Los Angeles Sci. Center, IBM, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "building; buildings; CAD; computational cost; cooling;
directed weather data filter; energy efficiency; energy
utilization --- Computer Applications; engineering
computing; heating; space; system; total energy; total
energy systems",
treatment = "A Application",
}
@Article{Bard:1978:AMV,
author = "Y. Bard",
title = "An analytic model of the {VM\slash 370} system",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "498--508",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "382.68033",
abstract = "An Analytic model is described of an interactive
multiprogrammed computer system. The model accepts a
multiple-user-class, transaction-oriented workload
description and a system configuration description, and
it produces predictions of resource utilizations,
transaction rates, and average transaction response
times. The solution method involves nearly complete
decomposition, with a closed queuing network
representing the multiprogrammed set. Asymptotic
formulas are used to generate good initial guesses for
an overall iterative scheme. Extensive validation
results are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "722; 723",
corpsource = "Cambridge Sci. Center, IBM, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytic model; average; closed queuing network;
computer performance prediction; computer selection and
evaluation; computer systems programming ---
Multiprogramming; computer systems, digital;
interactive multiprogrammed computer; interactive
systems; iterative scheme; multiprogrammed set model;
multiprogramming; resource utilizations; system;
transaction rates; transaction response times;
validation; virtual machines; virtual storage; VM/370",
treatment = "A Application",
}
@Article{Todd:1978:AHM,
author = "S. Todd",
title = "Algorithm and Hardware for a Merge Sort Using Multiple
Processors",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "509--517",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An algorithm is described that allows log (n)
processors to sort n records in just over 2n write
cycles, together with suitable hardware to support the
algorithm. The algorithm is a parallel version of the
straight merge sort. The passes of the merge sort are
run overlapped, with each pass supported by a separate
processor. The intermediate files of a serial merge
sort are replaced by first-in first-out queues. The
processors and queues may be implemented in
conventional solid logic technology or in bubble
technology. A hybrid technology is also appropriate.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130 (Data handling techniques)",
classification = "723",
corpsource = "United Kingdom Sci. Center, IBM, Durham, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems programming; logic circuits; magnetic
bubble devices; merging; multiple; processors; run
overlapped passes; sorting",
treatment = "P Practical",
}
@Article{Schild:1978:CDA,
author = "W. Schild and B. Lunenfeld and B. Gavish",
title = "Computer-Aided Diagnosis with an Application to
Endocrinology",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "518--532",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An interactive system for computer-assisted medical
diagnosis is described. Medical experts are provided
with a framework in which to translate the knowledge on
which their decisions are based. The technique is based
on simulating the physician's own diagnostic process.
The approach taken allows consistency and completeness
checks to be made, thereby achieving a high degree of
reliability. Information related to a given specialty
is described in terms of disorder patterns, clinical
facts, and logical relationships among the clinical
data. Laboratory results are processed by a subsystem
which uses physician-supplied rules to establish
validity and to interpret the test data with respect to
their diagnostic significance. The system incorporates
a dynamically generated questionnaire which provides
efficient gathering of anamnestic, observational, and
other clinical parameters. The physician is prompted
for relevant patient data by an algorithm which assures
that an almost minimal amount of information is
requested.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7330 (Biology and medical computing)",
classification = "461",
corpsource = "Israel Sci. Center, IBM, Haifa, Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "biomedical engineering; endocrinology; interactive
system; interactive systems; medical diagnostic
computing",
treatment = "A Application",
}
@Article{Sibuya:1978:NMN,
author = "M. Sibuya and T. Fujisaki and Y. Takao",
title = "Noun-Phrase Model and Natural Query Language",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "533--540",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Basic considerations in designing a natural data base
query language system are discussed. The notion of the
noun-phrase data model is elaborated, and its role in
making a query system suitable for general use is
stressed. An experimental query system, Yachimata,
embodying the concept, is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160 (Database management
systems (DBMS))",
classification = "723",
corpsource = "Tokyo Sci. Center, IBM, Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data base languages;
data base systems; data structures; database management
systems; interactive; interactive system; Japanese
language; language dialogue; model; natural; natural
query language; noun phrase; query system; systems;
Yachimata",
treatment = "A Application; G General Review",
}
@Article{Antonacci:1978:APQ,
author = "F. Antonacci and P. Dell'Orco and V. N. Spadavecchia
and A. Turtur",
title = "{AQL}: a Problem-Solving Query Language for Relational
Data Bases",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "541--559",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "AQL is a query language based on a data management
system which uses Codd's relational model of data. It
has been designed mainly to be used by the
nonspecialist in data processing for interactive
problem solving, application building, and simulation.
Ease of use is achieved by providing an interface which
allows the use of default options, synonyms, and
definitions of attributes, inference, and the
possibility of interactive completion of the query
(i.e., menu). AQL combines the capabilities of the
relational model of data with the powerful
computational facilities and control structure of the
host programming language (i.e., APL). A prototype
version of AQL, which has been implemented, is
reviewed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160D (Relational
databases)",
classification = "723",
corpsource = "Centro di Ricerca, IBM, Bari, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Codd's relational model; computer programming
languages; data base languages; data base management
system; data base systems; database management systems;
interactive system; interactive systems; problem
solving query language; relational data base",
treatment = "G General Review",
}
@Article{Antonacci:1978:APS,
author = "F. Antonacci and P. Dell'Orco and V. N. Spadavecchia
and A. Turtur",
title = "{AQL}: a problem-solving query language for
relational data bases",
journal = j-IBM-JRD,
volume = "22",
number = "??",
pages = "541--559",
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "382.68032",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lehmann:1978:INL,
author = "H. Lehmann",
title = "Interpretation of Natural Language in an Information
System",
journal = j-IBM-JRD,
volume = "22",
number = "5",
pages = "560--572",
month = sep,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Discussion of some of the linguistic problems
encountered during the development of the User
Specialty Languages (USL) system, an information system
that accepts a subset of German or English as input for
query, analysis, and updating of data. The system is
regarded as a model for portions of natural language
that are relevant to interactions with a data base. The
model provides insight into the functioning of language
and the linguistic behavior of users who must
communicate with a machine in order to obtain
information. The aim of application independence made
it necessary to approach many problems from a different
angle than in most comparable systems. Rather than a
full treatment of the linguistic capacity of the
system, details of phenomena such as time handling,
coordination, quantification, and pronouns are
presented. The solutions that have been implemented are
described, and open questions are pointed out.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160 (Database management
systems (DBMS))",
classification = "723",
corpsource = "Germany Sci. Center, IBM, Heidelberg, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data base languages;
data base systems; database management system; database
management systems; information system; interactive
system; interactive systems; language; natural; User
Specialty Languages",
treatment = "G General Review",
}
@Article{Reisman:1978:AGD,
author = "A. Reisman and K. C. Park",
title = "{AC} Gas Discharge Panels: Some General
Considerations",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "589--595",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An attempt is made to provide some perspective on the
key technology issues associated with AC gas panel
displays to set the stage for a series of nine
technology and physics-oriented papers that follow. It
uses the cathode ray tube as a reference for comparison
and defines some of the unique technological features
of matrix-addressed displays generally and AC gas
discharge panels specifically.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2380 (Gas discharge tubes and devices); B7260
(Display technology and systems)",
classification = "723; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas discharge panels; AC gas panel displays;
cathode ray tube; display devices; gas panel displays;
gas-discharge tubes; matrix addressed displays;
technology",
treatment = "G General Review",
}
@Article{Reisman:1978:SGP,
author = "A. Reisman and M. Berkenblit and S. A. Chan",
title = "Single-Cycle Gas Panel Assembly",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "596--600",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A single-cycle process has been developed in which the
two halves of a gas panel are assembled, sealed, and
filled in a continuous, automatically sequenced,
controlled-ambient furnace. The entire fabrication
operation, including seal, degas, backfill, and
tip-off, may be accomplished in a single thermal cycle.
During heat-up, the panel parts and furnace chamber are
degassed in a programmed cyclic fill (to 20 mm of Hg)
and pump-down (to 100 $\mu$ m of Hg). The panels are
sealed in a clean-air ambient at a temperature of 495
plus or minus 5 degree C. Prior to backfilling with a
purified Penning gas mixture and tip-off of the panel,
the same gas is used in a cyclic fill and evacuate
process to remove air and other contaminants. The
entire panel fabrication program takes about 8 hours.
Details of equipment construction operation are
presented, as well as advantages of the process
compared to conventional gas panel fabrication
processes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2330 (Electron tube technology and manufacture);
B2380 (Gas discharge tubes and devices); B7260 (Display
technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "backfill; degas; display devices; electron tube
manufacture; equipment construction; fabrication; gas
panel assembly; gas panel displays; gas-discharge;
purified Penning gas mixture; sea; single thermal
cycle; tipoff; tubes",
treatment = "P Practical",
}
@Article{Hammer:1978:OGP,
author = "Robert Hammer",
title = "Obtaining Gas Panel Metallization Patterns by Vacuum
Deposition Through Rib-Supported Mask Structures",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "601--606",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Gas discharge display panel metallization patterns
have been obtained directly in a single vacuum
deposition step through rib-supported mask structure.
This approach provides a simple alternative to
screening or photoetching. The rib-supported structures
were developed to solve problems of fabricating masks
containing long and narrow closely spaced apertures,
poorly supported cantilever sections, and free-standing
islands. The design of these structures minimize
shadowing from support ribs by using non-line-of-sight
deposition techniques. Made out of graphite to avoid
chemical attack during cleaning operations and
fabricated by air abrasion machining, the
self-supported masks are held in intimate
mask-to-substrate contact during vacuum deposition by
an electrostatic hold-down technique.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B2330 (Electron tube
technology and manufacture); B2380 (Gas discharge tubes
and devices); B7260 (Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air abrasion machining; design; display devices;
electron tube manufacture; electrostatic holddown; gas
panel display; gas panel metallization patterns;
gas-discharge; graphite; masks; metallisation; support
ribs; tubes; vacuum deposition",
treatment = "A Application; P Practical",
}
@Article{Park:1978:EEG,
author = "K. C. Park and E. J. Weitzman",
title = "{E}-Beam Evaporated Glass and {MgO} Layers for Gas
Panel Fabrication",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "607--612",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An electron-beam evaporation process has been
developed that is capable of depositing stable, thick,
borosilicate glass films (0.5-50 $\mu$ m) on various
substrates at a rate exceeding 0.5 $\mu$ m/min. A very
low stress of 4-10 multiplied by 10**7 N/m**2 in
compression was obtained in freshly deposited glass
films, and a further reduction below measurable levels
of stress was observed after a thermal annealing at 500
degree C. The effects of evaporation parameter
variation and thermal annealing on the film properties
of the borosilicate glass layers, as well as the MgO
secondary emission layers employed in the fabrication
of gas discharge display panels, are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B2330 (Electron tube
technology and manufacture); B2380 (Gas discharge tubes
and devices); B7260 (Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "borosilicate glass films; borosilicate glasses;
deposition; display devices; display panels; electron
beam; electron beam evaporation; electron tube
manufacture; fabrication; gas discharge; gas panel
displays; gas-discharge tubes; magnesium compounds;
MgO; secondary emission layers; stress; thermal
annealing",
treatment = "A Application; P Practical",
}
@Article{OHanlon:1978:EOC,
author = "John F. O'Hanlon and K. C. Park and A. Reisman and R.
Havreluk and J. G. Cahill",
title = "Electrical and Optical Characteristics of
Evaporable-Gas-Dielectric {AC} Gas Display Panels",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "613--621",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The characteristics are presented of a prototype gas
display panel fabricated with electron-beam deposited
dielectric films. It is shown that panels with a 6-
$\mu$ m-thick dielectric layer and a 0.2- $\mu$ m-thick
MgO layer exhibit short stabilization times (15 min),
long life (20,000 h), small drift effects (less than
0.5 V), and adequate brightness (21 cd/m**2). The
devices have a large dynamic write margin (greater than
10 V) over a wide pressure range. Dielectric glass
layers as thin as 3.2 $\mu$ m were found to be stable.
A panel with a small H$_2$O impurity concentration was
used to show that the hydrated MgO surface caused
charge leakage and loss of memory margin, while a panel
with an air leak confirmed that the surface saturated
before the effects of gas contamination were
observed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B2330 (Electron tube
technology and manufacture); B2380 (Gas discharge tubes
and devices); B7260 (Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas display panels; borosilicate glasses;
brightness; charge leakage; deposition; display
devices; drift effects; dynamic write margin;
electrical characteristics; electron beam; electron
beam deposition; evaporable glass dielectric; gas panel
displays; gas-discharge tubes; long life; loss of
memory margin; optical characteristics; prototype;
stabilization times",
treatment = "P Practical",
xxtitle = "Electrical and optical characteristics of
evaporable-glass-dielectric {AC} gas display panels",
}
@Article{Ahearn:1978:ERG,
author = "W. E. Ahearn and O. Sahni",
title = "Effect of Reactive Gas Dopants on the {MgO} Surface in
{AC} Plasma Display Panels",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "622--625",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental results are presented for the influence
of controlled levels of important reactive impurities
(N$_2$, O$_2$, H$_2$O, CO$_2$) on the aging
characteristics of the operating voltages of AC plasma
display panels. Details are also given of a novel
method of modifying the electronic properties of MgO
surfaces by discharge processing in an oxygen-doped
Ne-0.1\% Ar Penning mixture.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2330 (Electron tube technology and manufacture);
B2380 (Gas discharge tubes and devices); B7260 (Display
technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC plasma display panels; ageing; ageing
characteristics; discharge; display devices; gas panel
displays; gas-discharge tubes; impurities; MgO
surfaces; operating voltages; Penning mixture;
processing; reactive; reactive gas dopants",
treatment = "P Practical; X Experimental",
}
@Article{OHanlon:1978:PSA,
author = "John F. O'Hanlon",
title = "Phenomenological Study of {AC} Gas Panels Fabricated
with Vacuum-Deposited Dielectric Layers",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "626--633",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Results are presented of an experimental investigation
of AC gas display panel parameters. The ignition and
extinction voltages were measured for panels filled
with Ne-0.1\% Ar gas to pressures ranging from 0.75
multiplied by 10**4 Pa to 8 multiplied by 10**4 Pa (50
torr to 600 torr). The panels were constructed with
chamber spacings, d, of 0.56 multiplied by 10** minus
**2 cm to 2 multiplied by 10** minus **2 cm, and
electrode widths, x, of 1.5 multiplied by 10** minus
**3 cm to 0.1 cm. Scaling of the Paschen minimum was
not found to hold for the narrowest chamber spacing.
The dependence of ignition voltage on linewidth is
found to be proportional to exp (minus 1.6 x/d) for
(x/d) less than 1. An electron diffusion process was
invoked to explain this behavior.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B2330 (Electron tube
technology and manufacture); B2380 (Gas discharge tubes
and devices); B7260 (Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas panels; chamber; display devices; electron
diffusion process; electron tube testing; extinction
voltages; gas panel displays; gas-discharge tubes;
ignition voltage; Paschen minimum; spacing; vacuum
deposited coatings; vacuum deposited dielectric
layers",
treatment = "X Experimental",
}
@Article{Schlig:1978:CVC,
author = "E. S. Schlig and G. R. {Stilwell, Jr.}",
title = "Characterization of Voltage and Charge Transfer in
{AC} Gas Discharge Displays",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "634--640",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "New techniques have been applied to the
characterization of voltage and charge transfer in AC
gas discharge display cells. This study presents a new
method of measuring the voltage transfer curve and
several aspects of the operation of the cells which are
revealed by these measurements. In the steady sustain
region the voltage transfer is nearly equal to the
initial gas voltage. Over most of the voltage transfer
curve, the voltage transferred is independent of the
history and operating environment of the test cell. On
the other hand, the charge transfer does depend upon
these factors. The voltage and charge transferred vary
differently with the initial gas voltage, so the
effective wall capacitance depends upon the initial
wall voltage as well as on history and environment.
This is attributed to the dependence of the lateral
spread of the discharge upon its strength.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2380 (Gas discharge tubes and devices); B7260
(Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas discharge displays; capacitance; charge
transfer; display devices; effective wall; electron
tube testing; gas panel displays; gas-discharge tubes;
history; lateral spread; operating environment; voltage
transfer curve",
treatment = "P Practical",
}
@Article{Lanza:1978:NCC,
author = "C. Lanza and O. Sahni",
title = "Numerical Calculation of the Characteristics of an
Isolated {AC} Gas Discharge Display Panel Cell",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "641--646",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Device characteristics calculated from a
one-dimensional dynamic simulation, incorporating space
charge effects, of the gaseous discharge occurring at
an isolated cell of an AC gas discharge panel are
presented. The theoretical model shows all the
qualitative features associated with plasma panels, and
the quantitative agreement with experimental data
inspires confidence in the general validity of the
method.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2315 (Gas discharges); B2380 (Gas discharge tubes and
devices); B7260 (Display technology and systems)",
classification = "722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC gas discharge display panel; charge; charge
effects; device characteristics; display devices;
dynamic simulation; gas panel displays; gas-discharge
tubes; isolated cell; numerical calculation; panels;
plasma; simulation; space; theoretical model",
treatment = "T Theoretical or Mathematical",
}
@Article{Brusic:1978:AAG,
author = "V. Brusic and F. M. d'Heurle and R. D. MacInnes and E.
I. Alessandrini and J. J. Dempsey and J. Angilello and
M. Sampogna",
title = "{Al-Cu} Alloy for Gas Panels",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "647--657",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The composition, phase formation, stress, resistivity,
and, in particular, the oxidation and corrosion
behavior of Cu-Al films with a variety of Cu:Al ratios
have been determined. Their relevance to the gas panel
is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0530 (Metals and alloys (engineering materials
science)); B2330 (Electron tube technology and
manufacture); B2380 (Gas discharge tubes and devices);
B7260 (Display technology and systems)",
classification = "541; 544; 722; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al-Cu alloy; aluminium alloys; aluminum copper alloys;
composition; copper alloys; corrosion; Cu-Al films;
display devices; electronic conduction in metallic thin
films; gas panel; gas panel displays; gas-discharge;
oxidation; phase formation; resistivity; stress;
tubes",
treatment = "A Application",
}
@Article{Chow:1978:CSW,
author = "F. I. Chow and P. A. Engel and D. C. Heath and S.
Lawphongpanich",
title = "Contact Stress and Wear Study for Type Characters",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "658--667",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "To ensure the structural integrity of solid print
characters subjected to millions of stress cycles, the
contact stresses encountered in service must be known.
Various type geometries are explored for their
influence on stress distribution. A linear programming
method of stress analysis is adopted. Experimental
analysis and wear characteristics are considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1180 (Optimisation techniques); C3350L (Control
applications in printing and associated industries);
C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment --- Printers; contact
stresses; linear programming; printers; stress
analysis; stress distribution; structural integrity;
type characters; type geometries; typewriters; wear;
wear characteristics",
treatment = "P Practical",
}
@Article{Bayer:1978:MWR,
author = "R. G. Bayer",
title = "Mechanism of Wear by Ribbon and Paper",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "668--674",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "While wear by materials such as ribbon and paper
represents a significant and identifiable problem in
the business machine industry, it has received little
attention in the wear literature. The results of a
study into the nature of the wear processes involved
and the various factors which influence them are
presented. A significant result of that study is the
conclusion that the basic wear processes for both
materials are similar, i.e., abrasion by small hard
particles as compared to an adhesive mechanism for
paper as proposed by some in the literature.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "722",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment",
}
@Article{Polleys:1978:WFH,
author = "R. W. Polleys",
title = "Work-Hardening of Ferrite Head Surfaces by Wear with
Flexible Recording Media",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "675--680 (or 676--680??)",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The ferrite surfaces of rotating magnetic heads were
found to have been work-hardened to different degrees
depending upon the abrasiveness of the flexible
recording media used. For the more abrasive tape, the
work-hardening was less than for the less abrasive
tape. Associated with the increase in microhardness was
decreased signal read-back and increased incidence of
surface ``pull-outs''. These phenomena may be
understood in the context of fracture mechanics where
residual stress, resulting from plastic deformation of
the ferrite, is predominant in the wear mechanism.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3110E (Ferrites and garnets); B3120B (Magnetic
recording)",
classification = "722",
corpsource = "IBM General Products Div., Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abrasiveness; data storage, magnetic; ferrite devices;
ferrite head surfaces; flexible recording media;
fracture mechanics; hardening; internal stresses;
magnetic heads; magnetic recording heads;
microhardness; plastic deformation; residual stress;
rotating magnetic heads; surface; wear; work
hardening",
treatment = "X Experimental",
}
@Article{Roshon:1978:EDC,
author = "D. D. Roshon",
title = "Electroplated Diamond-Composite Coatings for Abrasive
Wear Resistance",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "681--686",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Electroplated diamond-composite coatings are described
which are capable of attaining wear resistance a number
of orders of magnitude greater than conventional
materials when subjected to abrasion by paper. The
coatings consist of a single layer of diamond particles
held in a matrix of electroplated metal. During the
course of these studies, many parameters were found to
play important roles in the wear resistance. These
parameters include the diamond particle size, its size
distribution, the particle density, particle shape,
plating uniformity, and the properties of the matrix
metal. The influence of these variables is discussed,
and the results of the wear testing are presented. The
plating process is also briefly described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8120J (Preparation of dispersion-,fibre-, and
platelet-reinforced metal-based composites); A8140P
(Friction, lubrication, and wear)",
classification = "421",
corpsource = "IBM System Products Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abrasion; abrasion by paper; abrasive wear resistance;
coatings; composite materials; diamond; diamond
particles; electroplated; matrix of electroplated
metal; particle; particle density; particle shape;
particle size; plating process; plating uniformity;
protective coatings; size; size distribution; wear of
materials --- Protective Coatings; wear resistant
coatings; wear testing",
treatment = "P Practical",
}
@Article{Phillips:1978:CEE,
author = "A. {Phillips, Jr.}",
title = "Calculations of the Effect of Emitter Compensation on
$\beta$ and $f_t$ of Bipolar Devices",
journal = j-IBM-JRD,
volume = "22",
number = "6",
pages = "687--689",
month = nov,
year = "1978",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Significant increases in bipolar device beta and f$_T$
are predicted when emitter compensation is reduced. The
prediction was made after accurately calculating all
room temperature device parameters with a bipolar
device program. The use of empirical
concentration-dependent energy gap values allowed the
accurate device calculation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors)",
classification = "714",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amplification; beta; bipolar devices; bipolar
transistors; compensation; emitter compensation;
energy; energy gap; f/sub T/; gap; semiconductor device
models; transistors, bipolar",
treatment = "T Theoretical or Mathematical",
}
@Article{Keller:1979:EPR,
author = "John H. Keller and William B. Pennebaker",
title = "Electrical Properties of {RF} Sputtering Systems",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "3--15",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A theory is developed that gives a relatively complete
electrical characterization of RF sputtering systems.
Three types of systems are analyzed: tuned substrate,
driven substrate, and controlled area ratio of
electrode (CARE) systems. The theory is applicable to
any of these systems that do not use magnetic fields to
confine the plasma. Given the input RF power and
voltage at the target, and any other parameters that
can be specified as independent variables. The theory
provides explicit values for all DC and RF electrical
parameters of system. The DC bias developed at the
substrate is explained and related to the resputtering
energy. In addition, an approximate calculation is
presented for the ion density in the plasma; this
calculation allows a semiquantitative estimate of the
RF voltage developed at the target for a given value of
RF input power. It also shows the influence of pressure
and frequency on RF sputtering system operation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8115C (Deposition by sputtering); B0520F (Vapour
deposition)",
classification = "539",
corpsource = "Data Systems Div., IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "controlled area ratio of; DC bias; driven substrate;
electrical characterization; electrode; ion density;
plasma density; plasma theory; radiofrequency
sputtering; resputtering energy; RF sputtering systems;
sputtering; substrate; tuned",
treatment = "T Theoretical or Mathematical",
}
@Article{Pennebaker:1979:ISI,
author = "William B. Pennebaker",
title = "Influence of Scattering and Ionization on {RF}
Impedance in Glow Discharge Sheaths",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "16--23",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The effects of scattering and ionization on the RF
impedance of a glow discharge sheath are calculated
using an equivalent DC sheath model. The effects of
scattering are treated in terms of a drag force;
equilibrium between the ion drift velocity and field is
not required. The ratio of first ionization coefficient
to pressure, alpha / rho, is assumed to be constant,
and the ion energy and ion current injected from the
glow are assumed as initial parameters. The results of
this calculation, obtained by numeric integration, can
be accurately approximated by an interpolation formula.
This formula provides a simple means for calculating
the RF impedance of a sheath.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5220H (Atomic, molecular, ion and heavy particle
collisions in plasma); A5240K (Plasma sheaths); A5280H
(Glow and corona discharges); B2315 (Gas discharges)",
classification = "539; 701",
corpsource = "Res. Div., IBM Corp., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "collision processes; equivalent DC sheath; glow
discharge sheaths; glow discharges; interpolation;
interpolation formula; ionisation of gases; ionization;
model; plasma; plasma sheaths; RF impedance;
scattering; sputtering",
treatment = "T Theoretical or Mathematical",
xxtitle = "Influence of scattering and ionization on {RF}
impedance of glow discharge sheaths",
}
@Article{Keller:1979:SPM,
author = "John H. Keller and Royce G. Simmons",
title = "Sputtering Process Model of Deposition Rate",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "24--32",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model of the sputtering process has been developed
that predicts the deposition rate of a sputtering
system with parallel-plate geometry. By using data for
sputtering yield vs voltage obtained from an ion-beam
sputtering system, the model applies a new theory for
computing the backscatter of the sputtered material,
and, from the results, predicts deposition rates. The
model also considers the effects of charge exchange in
the sheaths, and of re-emission of sputtered material
at the substrate. The model is valid for magnetic,
tuned substrate, driven substrate, and controlled area
ratio diode systems. Comparison with observed
deposition rates shows good agreement for clean
systems. An experimental APL program that uses the
model has been written.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5240K (Plasma sheaths); A5265 (Plasma simulation);
A8115C (Deposition by sputtering); B0520F (Vapour
deposition); C7410D (Electronic engineering
computing)",
classification = "539",
corpsource = "Data Systems Div., IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL program; backscatter; charge; charge exchange;
controlled area ratio diode; deposition rate; driven;
driven substrate; electronic engineering computing;
exchange; modelling; particle backscattering; plasma
sheaths; sheaths; sputtering; sputtering process model;
sputtering system; substrate; tuned substrate",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Coburn:1979:SCA,
author = "John W. Coburn and Eric Kay",
title = "Some Chemical Aspects of the Fluorocarbon Plasma
Etching of Silicon and its Compounds",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "33--41",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Mass spectrometric sampling of fluorocarbon glow
discharges and in situ measurements of the etch rate of
Si and SiO$_2$ with quartz crystal microbalances have
been used to provide additional insight concerning the
chemistry involved when additive gases such as O$_2$,
H$_2$, N$_2$, H$_2$O,and C$_2$F$_4$ are injected into a
CF$_4$ glow discharge. The results indicate that the
etching behavior of the discharge is not significantly
influenced by the molecular structure of the injected
gas molecules but is determined primarily by the
elemental composition of the glow discharge. This
phenomenologically observed result can be used to
predict qualitatively the relative etching behavior of
a large class of gaseous etchant mixtures as well as
the role of various electrode or wall materials in the
plasma etching process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5280H (Glow and corona discharges); A8280M (Mass
spectrometry (chemical analysis)); B2315 (Gas
discharges); B2550E (Surface treatment for
semiconductor devices)",
classification = "714; 932",
corpsource = "Res. Div., IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "C/sub 2/F/sub 4/; chemistry; etch rate; etching;
fluorocarbon glow discharges; gaseous etchant; glow
discharges; H/sub 2/; H/sub 2/O; mass spectroscopic
chemical analysis; mixtures; N/sub 2/; O/sub 2/; plasma
etching process; plasmas; quartz crystal microbalances;
reactive ion etching; semiconductor device manufacture;
Si; silicon; silicon compounds; SiO/sub 2/; sputter
etching",
treatment = "A Application; X Experimental",
}
@Article{Pacansky:1979:PDM,
author = "Jacob Pacansky and James R. Lyerla",
title = "Photochemical Decomposition Mechanisms for Az-Type
Photoresists",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "42--55",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The photochemical decomposition mechanism of
orthonaphthoquinonediazides has been investigated
principally by infrared and carbon-13 nuclear magnetic
resonance spectroscopies. The results demonstrate that
the decomposition proceeds via a ketene intermediate to
a photoproduct, the nature of which depends on the
reaction conditions. Model resist systems were prepared
by mixing orthonaphthoquinonediazides and
2,3,6-trimethylphenol or the diazide plus Novolak
resin. Under ambient thermal and humidity conditions,
ultraviolet (UV) exposure of the diazide yields
3-indenecarboxylic acid as the final photoproduct.
However, UV exposure in vacuo results in ester
formation via a ketene-phenolic OH reaction. The
decomposition pathway and ensuing reactions have been
shown to be the same for both 1- and
3-orthonaphthoquinonediazides attached to mono-and
trihydroxybenzophenones. The technological implications
for resist processing derived from these studies are
also discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques)",
classification = "713",
corpsource = "Res. Div., IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "decomposition mechanisms; ester formation; exposure;
infrared spectra of organic molecules and substances;
integrated circuit manufacture;
orthonaphthoquinonediazides; photochemical; photolysis;
photoproduct; photoresists; radiofrequency and
microwave; spectra of organic molecules and substances;
ultraviolet",
treatment = "X Experimental",
xxtitle = "Photochemical decomposition mechanisms for {AX-type}
photoresists",
}
@Article{Blumentritt:1979:APT,
author = "Bruce F. Blumentritt",
title = "Annealing of Poly(Ethylene Terephthalate)-Film-Based
Magnetic Recording Media for Improved Dimensional
Stability",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "56--65",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "PET-film-based magnetic recording media are subject to
a number of dimensional instabilities, a major one
being in-plane shrinkage due to stress relaxation in
the biaxially oriented substrate. Annealing the media
allows stress relaxation without significantly
degrading other properties and makes possible the use
of higher track densities. Effects of annealing on
mechanical properties, coefficients of thermal and
hygroscopic expansion, and long-term dimensional
stability of the media are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics (engineering materials
science))B3120B (Magnetic recording); C5320C (Storage
on moving magnetic media)",
classification = "722; 817",
corpsource = "General Systems Div., IBM Corp., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealed polymers; annealing; data storage, magnetic;
dimensional; expansion; hygroscopic expansion; magnetic
recording; magnetic recording media; mechanical
properties; poly(ethylene terephthalate) film;
polyethylenes --- Film; polymer films; shrinkage;
stability; stress relaxation; thermal; thermal
expansion",
treatment = "A Application",
}
@Article{Blumentritt:1979:LFI,
author = "Bruce F. Blumentritt",
title = "Laminated Films with Isotropic In-Plane Properties",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "66--74",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Commercially available polymer films used in
structural applications, such as biaxially oriented
poly(ethylene terephthalate), exhibit pronounced
anisotropy in mechanical properties, thermal expansion,
and long-term dimensional stability. Films with more
nearly isotropic in-plane properties have been produced
by laminating plies of PET film at various angles to
one another. In addition, composite films have been
made with nearly isotropic properties and with
significantly reduced coefficients of expansion
compared to those of commercially available polymer
films. A laminate with PET faces bonded to a low
expansion alloy foil core had the best dimensional
stability and the least anisotropy of the films
studied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics (engineering materials
science))B3120B (Magnetic recording); C5320C (Storage
on moving magnetic media)",
classification = "722; 817",
corpsource = "General Systems Div., IBM Corp., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alloy foil core; data storage, magnetic --- Disk;
dimensional; isotropic inplane properties; laminate;
laminates; magnetic recording; mechanical properties;
plastics laminates; poly(ethylene; polymer films;
stability; terephthalate) films; thermal expansion",
treatment = "X Experimental",
}
@Article{Franaszek:1979:FBC,
author = "Peter A. Franaszek",
title = "On Future-Dependent Block Coding for Input-Restricted
Channels",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "75--81",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A29",
MRnumber = "80h:94019",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Consider a restricted channel whose constraints may be
characterized by a finite state machine model.
Conventional coding techniques for such channels result
in codes where the choice of a word to be transmitted
is only a function of the current state and the
information to be represented by this word. This paper
develops techniques for constructing codes where the
code word choice may also depend on future information
to be transmitted. it is shown that such
future-dependent codes exist for channels and coding
rates where no conventional code may be constructed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
classification = "716; 718; 723",
corpsource = "Res. Div., IBM Corp., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "codes, symbolic; communication channels; digital
communication systems; encoding; finite state machine
model; future dependent block coding; information
theory; input restricted channels",
reviewer = "Robert Gray",
}
@Article{Ahuja:1979:ACN,
author = "Vijay Ahuja",
title = "Algorithm to Check Network States for Deadlock",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "82--86",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of checking the states of a system for
deadlock is treated for a single class of systems, or
networks, and for a single class of resources, or
buffers. An algorithm is described that, for a given
state, requires O left bracket m plus n**2 right
bracket operations, where m and n are, respectively,
the number of tasks and nodes in the state.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques)",
classification = "723",
corpsource = "System Communications Div., IBM Corp., Research
Triangle Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; computer networks; computers; deadlock;
network state checking",
treatment = "T Theoretical or Mathematical",
}
@Article{Bogy:1979:BLJ,
author = "David B. Bogy",
title = "Break-Up of a Liquid Jet: Second Perturbation Solution
for One-Dimensional {Cosserat} Theory",
journal = j-IBM-JRD,
volume = "23",
number = "1",
pages = "87--92",
month = jan,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The second perturbation solution is derived within the
nonlinear one-dimensional Cosserat theory for a liquid
jet emanating from a nozzle with harmonic excitation.
Numerical results are presented for parameters relevant
to ink-jet printing technology. Satellite drops are
predicted but always in the backward merging condition.
The results are compared with the corresponding
solution obtained by W. T. Pimbley and H. C. Lee, who
used a different one-dimensional set of equations with
a different formulation of the problem and obtained
forward merging satellite drops under some
conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4755C (Jets in fluid dynamics); A4755E (Nozzles);
C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "Univ. of California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "backward merging; computer peripheral equipment;
dimensional Cosserat theory; excitation; harmonic; ink;
ink-jet printing; inkjet printing; jet breakup; jets;
liquid jet; merging; nonlinear one; nozzle; nozzles;
perturbation techniques; printing; satellite drops;
second perturbation solution",
treatment = "T Theoretical or Mathematical",
}
@Article{Chance:1979:HPP,
author = "Dudley A. Chance and Jean-Claude A. Chastang and V. S.
Crawford and Richard E. Horstmann and R. O. Lussow",
title = "{HeNe} Parallel Plate Laser Development",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "108--118",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A parallel plate format is used for fabricating
``hard'' sealed HeNe lasers. The new packaging geometry
and construction process are suitable for large scale
manufacturing. Cut plate, molded plate, and folded beam
lasers have been built and tested. Several changes from
conventional lasers, such as evaporated film cathode
and anode, square cross section bore, glass sealed
Brewster windows, and ``soft'' glass bore materials,
are discussed. The power output capability,
measurements of gain and loss parameters, and the
reliability of these lasers are also considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4260B (Design of specific laser systems); B4320C (Gas
lasers); B4320M (Laser accessories and
instrumentation)",
classification = "744",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "construction; cut plate; evaporated film anode;
evaporated film cathode; folded beam lasers; gain; gas
lasers; glass bore materials; glass sealed Brewster
windows; He-Ne lasers; laser accessories; lasers ---
Testing; lasers, gas; loss; molded; packaging; parallel
plate; plate; power output; reliability",
treatment = "P Practical",
}
@Article{Chance:1979:CHL,
author = "Dudley A. Chance and Vlosta Brusic and V. S. Crawford
and Robert D. Macinnes",
title = "Cathodes for {He-Ne} lasers",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "119--127",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Vapor deposited aluminum cathodes for parallel plate
HeNe lasers have been used with considerable success.
It is shown that the aluminum cold cathode is improved
by the addition of copper and that other alloying
elements of bulk Al2024 do not contribute to cathode
performance. The plasma oxidation process of Hochuli
improves cathode performance by cleaning the surface
and optimizing the oxide film for maximum efficiency.
There appears to be a trade-off between life and
electron tunneling efficiency for optimum oxide
thickness. Auger electron spectroscopy, ellipsometry,
and scanning electron microscopy are the techniques
used for surface characterization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4260B (Design of specific laser systems); B4320C (Gas
lasers); B4320M (Laser accessories and
instrumentation)",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accessories; Al-Cu alloys; aluminium alloys; Auger
electron spectroscopy; cathode; cathodes; cleaning;
coatings; cold cathode; copper alloys; efficiency;
electron tunneling efficiency; ellipsometry; film; gas
lasers; He-Ne lasers; laser; laser accessories; lasers,
gas; oxide; oxide coated; oxide coated cathodes; plasma
oxidation process; scanning electron microscopy;
thickness; vapour deposited; vapour deposited
coatings",
treatment = "P Practical; X Experimental",
}
@Article{Ahearn:1979:NAH,
author = "William E. Ahearn and Richard E. Horstmann",
title = "Nondestructive Analysis for {HeNe} Lasers",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "128--131",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The methods used to measure the gas properties in
sealed helium-neon lasers are described. Such
parameters as total gas pressure, minor constituent
concentration (i.e., He\slash Ne ratio), and gas purity
can be measured using spectral emission methods. How
these parameters and measurement techniques relate to
the electrical operating characteristics of the laser
is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255F (Inert gas lasers); A4260 (Laser systems and
laser beam applications); A8280D (Electromagnetic
radiation spectrometry (chemical analysis)); B4320C
(Gas lasers); B4320M (Laser accessories and
instrumentation)",
classification = "744; 801",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atomic emission spectroscopy; chemical analysis;
concentration; electrical; gas lasers; gas pressure;
gas purity; gases, inert --- Spectroscopic Analysis;
He-Ne lasers; lasers, gas; measurement; nondestructive;
nondestructive analysis; operating characteristics;
spectral emission; testing",
treatment = "P Practical",
}
@Article{Chastang:1979:PPP,
author = "Jean-Claude A. Chastang",
title = "Polarization Problems of Parallel Plate Lasers",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "132--139",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Parallel plate laser technology requires that the
plasma envelope and particularly the Brewster windows
be ``hard sealed.'' The first part of this study
reports the effects of misalignments of the Brewster
windows on laser performance. This turned out not to be
a serious problem. In the second part, the increase in
the birefringence of the Brewster windows resulting
from the hard seal technique is examined. It is found
that this problem, which is serious, can be eliminated
by careful control of the temperature during sealing
and the annealing process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4260B (Design of specific laser systems); B4320M
(Laser accessories and instrumentation)",
classification = "744",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealing; birefringence; Brewster windows; hard seal
technique; laser accessories; lasers; misalignments;
parallel plate lasers; plasma envelope; polarisation;
sealing; seals (stoppers); temperature control",
treatment = "P Practical; X Experimental",
}
@Article{Franaszek:1979:RSF,
author = "Peter A. Franaszek and James P. Considine",
title = "Reduction of Storage Fragmentation on Direct Access
Devices",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "140--148",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A technique is described for partially reorganizing
the contents of disk storage so as to reduce the level
of fragmentation. The method entails choosing that
fraction of the contents which is estimated to have the
greatest impact on the free space distribution,
followed by the relocation of these data to more
favorable locations, subject to the system integrity
requirements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C6120 (File
organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access storage; data storage, magnetic; direct access
storage; disc storage; file organisation; free space
distribution; magnetic; magnetic disc and drum storage;
memory hierarchy; random-; storage fragmentation",
treatment = "P Practical",
}
@Article{Rissanen:1979:AC,
author = "Jorma J. Rissanen and Glen G. {Langdon, Jr.}",
title = "Arithmetic Coding",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "149--162",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94B40",
MRnumber = "81j:94024",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The earlier introduced arithmetic coding idea has been
generalized to a very broad and flexible coding
technique which includes virtually all known variable
rate noiseless coding techniques as special cases. An
outstanding feature of this technique is that alphabet
extensions are not required. A complete decodability
analysis is given. The relationship of arithmetic
coding to other known nonblock codes is illuminated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
classification = "716; 723",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arithmetic coding; block codes; codes; codes,
symbolic; decodability analysis; encoding; information
theory --- Bandwidth Compression; nonblock codes;
variable rate noiseless coding",
treatment = "T Theoretical or Mathematical",
}
@Article{Weinberger:1979:HPL,
author = "Arnold Weinberger",
title = "High-Speed Programmable Logic Array Adders",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "163--178",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Programmable Logic Array (PLA) adders are described
which perform an addition in one cycle with a single
pass through a PLA and require a reasonable number of
product terms for an 8-, 16-, or even a 32-bit adder.
The PLA features two-bit input decoders feeding an AND
array followed by an OR array whose outputs are
pairwise Exclusive-ORed. Carry-look-ahead adder
equations, adapted to the PLA to require relatively few
product terms, are adjusted for maximum sharing of
product terms. The number of unique product terms is a
relative measure of one of the physical dimensions of
the PLA. Equations for contiguous sum bits are grouped
into strings, each using a common input carry. A
procedure optimally assigns sum bits to strings to
further minimize the total number of unique product
terms. The methods are extended to PLAs with decoders
of increased inputs and substantially reduced product
terms. They can serve as dedicated macro functions on a
chip, using special decoders relevant to adders. As a
result, the other PLA dimension comprising the number
of outputs from all input decoders increases only
moderately, and can even decrease, with larger
decoders. Finally, the PLA adder can be further
substantially compressed by splitting the OR array into
two parts such that a row of the AND array is shared
between two product terms, and an OR array column is
shared between two sums of product terms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5120 (Logic and switching
circuits)C5230 (Digital arithmetic methods)",
classification = "721; 722",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adders; cellular arrays; computers; design; high speed
adder; logic; logic design; programmable logic array
adder",
treatment = "P Practical",
}
@Article{Chen:1979:TSB,
author = "William T. Chen and Carl W. Nelson",
title = "Thermal Stress in Bonded Joints",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "179--188",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper considers the stress distributions in
bonded materials induced by differential expansion or
contraction of these materials. The analytical approach
is similar to the lap joint theories attributed to
Volkersen and expanded by Goland and Reissner. Several
simple and typical analytical models are presented to
bring out the relative importance of different
geometrical and material parameters and to give some
insight into different modes in which the bonds might
fail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0150 (Electrical contracting and installation)",
classification = "714; 913; 944",
corpsource = "IBM System Products Div. Lab., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adhesion; analytical models; bonded materials;
electron device manufacture; electronic devices; lap
joint; modelling; reliability; stress distributions;
stresses; thermal; thermal stresses; thermal variables
measurement",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Reed:1979:ISA,
author = "Martin A. Reed and Terence D. Smetanka",
title = "Implications of a Selective Acknowledgment Scheme on
Satellite Performance",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "189--196",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The long propagation delay inherent to satellite
communications may lead to a degradation in data link
response time as compared to the same transmission over
purely terrestrial links. Furthermore, data link errors
need be considered in any such study of response time
of satellite data links. A model has been developed to
study data link response time under a selective
acknowledgment retransmission protocol. The model not
only calculates mean link response time, but also the
second moment of the response time. This model is then
applied to various interactive data transmission
schemes over a half-duplex (HDX) satellite link with
terrestrial tails, although modifications can easily be
made to analyze pure terrestrial or satellite links.
The model parameters include bit error rate (BER),
terrestrial as well as satellite propagation delay,
modem transit delay, MAXOUT (maximum number of
unacknowledged data frames), frame size (bits), and
message size (bits).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210 (Telecommunication applications); B6250G
(Satellite relay systems)",
classification = "716",
corpsource = "IBM System Communications Div., Gaithersburg, MD,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bit; data communication systems; data link; data
transmission; delay; error rate; frame size; half
duplex satellite link; interactive data transmission;
message size; model; modelling; modem transit; response
time; retransmission protocol; satellite links;
satellite propagation delay; selective acknowledgment;
selective acknowledgment scheme; telecommunication
links, satellite; terrestrial propagation delay;
unacknowledged data frames",
treatment = "A Application; T Theoretical or Mathematical",
xxtitle = "Implications of a selective acknowledgement scheme on
satellite performance",
}
@Article{Greenberg:1979:SHI,
author = "Hermo J. Greenberg",
title = "Study of Head-Tape Interaction in High Speed Rotating
Head Recording",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "197--205",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The steady state tape dynamics resulting from the
interaction of a high speed rotating head and a
flexible recording tape are formulated within the
framework of linear shell theory. Tape displacements in
the area above the head are coupled with the solution
to the Reynolds equation in order to calculate the film
thickness (flying height) between head and tape.
Simulated results for spherical heads are compared to
observed behavior on experimental systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320 (Digital storage)",
classification = "752",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "dynamics; film thickness; flexible recording tape;
heads; high speed rotating head; linear; magnetic
heads; magnetic recording; magnetic tape; Reynolds
equation; rotating head recording; shell theory;
spherical; tape displacement; tape head interface; tape
recorders",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Huang:1979:RPM,
author = "Ting C. Huang",
title = "Rapid and Precise Method for Analysis of Energy
Dispersive {X}-Ray Spectra",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "206--213",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new, precise, and rapid method for the analysis of
energy dispersive x-ray spectra generated by electron
beam or x-ray excitation is presented. It includes the
use of Gaussian profiles and a polynomial of I/E (where
E is the x-ray energy) to represent the observed x-ray
characteristic lines and background, automatic
sectioning of the entire spectrum, and a figure of
merit to estimate goodness of fit. Details of the
method and its programming techniques are given.
Results of analyzing complicated energy dispersive
X-ray (EDX) spectra of multi-element alloys are
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650D (Data gathering, processing, and recording,
data displays including digital techniques); A8280D
(Electromagnetic radiation spectrometry (chemical
analysis)); C7320 (Physics and chemistry computing)",
classification = "921; 932",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; computing; curve fitting; energy dispersive
X-ray; Gaussian profiles; mathematical models; multi
element alloy analysis; polynomial; spectra;
spectrochemical analysis; spectroscopy; spectroscopy
computing; X-ray chemical analysis; X-ray spectra;
X-ray spectrochemical; x-rays",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Dave:1979:CAF,
author = "Jitendra V. Dave",
title = "Contrast Attenuation Factors for Remote Sensing",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "214--224",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Attenuation factors for the contrast of objects lying
on the earth's surface and observed through five
different atmospheric models are calculated as a
function of the wavelength (0.31-0.9935 $\mu$ m), solar
zenith angle, ground reflectivity, and the nadir and
azimuth angles of view. The first model is free of
aerosols and absorbing gases. Absorption by average
amounts of oxygen, ozone, and water vapor is included
in the remaining four models. The second model is also
free of aerosols, but the last three models contain
aerosols in the form of a spherical polydispersion made
from a substance with a spectrally independent
refractive index of 1.5-0.01 i. Models 3 and 4 are
expected to represent, respectively, the average and
strong turbid conditions encountered over large
continental areas. Models 3 and 5 contain aerosols with
different size distribution characteristics, but have
the same amount of aerosol mass loading per unit
horizontal area. The contrast attenuation factor is
found to increase with an increase in wavelength and
reflectivity of the surrounding surface, and a decrease
in the atmospheric turbidity and gaseous attenuation.
It also depicts strong azimuthal dependence especially
for models illuminated by low-altitude solar radiation
of longer wavelengths.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9265 (Atmospheric optics); A9385 (Instrumentation and
techniques for geophysical, hydrospheric and lower
atmosphere research); B7710B (Atmospheric, ionospheric
and magnetospheric techniques and equipment)",
classification = "481; 657; 732; 921",
corpsource = "IBM Data Processing Sci. Centre, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.31 to 0.9935 microns; absorbing gases; absorption;
aerosols; atmospheric; atmospheric models; atmospheric
optics; atmospheric techniques; atmospheric turbidity;
azimuthal dependence; contrast attenuation factor;
earth atmosphere --- Mathematical Models; ground
reflectivity; light; light absorption; light
scattering; modelling; optics; remote sensing;
scattering; solar zenith angle; spherical
polydispersion",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Pippenger:1979:ACT,
author = "Nicholas Pippenger",
title = "On the Application of Coding Theory to Hashing",
journal = j-IBM-JRD,
volume = "23",
number = "2",
pages = "225--226",
month = mar,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Quick proofs are given for the characterization (due
to Schay, Raver, Hanan, and Palermo) of the collision
distance of a linear hashing function and for a dual
notion (called the restriction distance), which relates
to the accessibility of addresses by sets of keys and
the uniform distribution of sets of keys over
addresses.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130 (Data handling techniques)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accessibility; codes; codes, symbolic; coding theory;
collision distance; data processing --- File
Organization; encoding; key to address; keys
distribution; linear hashing function; of addresses;
transformation",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Stillman:1979:SMB,
author = "R. Stillman",
title = "Simulation of a Moving Bed Gasifier for a Western
Coal",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "240--252",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an adiabatic steady state plug
flow model for a moving bed coal gasifier with
gas-solid heat transfer. The model considers 17 solid
stream components, 10 gas stream components and 17
reactions. The kinetic and thermodynamic parameters
were derived for a Wyoming subbituminous coal. Examples
of calculated results are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B8230 (Thermal power stations and plants)",
classification = "522; 524; 631",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adiabatic flow; chemically reactive flow; coal; coal
gasification; coal gasifier; combustion; flow of fluids
--- Analogies; heat transfer; model; modelling; moving
bed; simulation; steady state plug flow; subbituminous
coal",
treatment = "T Theoretical or Mathematical",
}
@Article{McCumber:1979:ACA,
author = "W. H. McCumber and M. W. Weston",
title = "Analysis and Comparison of Actual to Predicted
Collector Array Performances",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "253--269",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Hottel-Whillier-Bliss (HWB) equation has been the
standard tool for the evaluation of collector thermal
performance for four decades. This paper presents a
technique that applies the criteria of ASHRAE Standard
93-77 to the determination of the HWB equation
coefficients from field-derived data. Results of the
analysis of a sample collector array illustrate the
technique. Actual dynamic performances of various
collector arrays in the field are compared to those
predicted by the steady-state efficiency models for the
individual panels. In certain cases, the HWB model
produces deviations of over 100\% from measured hourly
performances and 35\% from measured monthly
performances when compared with the single-panel
laboratory-derived model. However, when the
field-derived HWB model is used as the basis of
comparison the performance deviations were typically
less than 5\%.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8630R (Thermal energy conversion (heat engines and
heat pumps))",
classification = "657; 702",
corpsource = "IBM Federal Systems Div., Huntsville, AL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array; dynamic performances; efficiency models; heat
transfer; Hottel Whillier Bliss equation; solar
absorber-convertors; solar cells; solar collector;
solar radiation --- Collectors",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Ciszek:1979:SSD,
author = "T. F. Ciszek and G. H. Schwuttke and K. H. Yang",
title = "Solar-Grade Silicon by Directional Solidification in
Carbon Crucibles",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "270--277",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Directional solidification of silicon in carbon
crucibles was achieved by using two variations of the
Bridgman-Stockbarger method. One was a static technique
wherein liquid silicon in a carbon crucible was
positioned in a temperature gradient of about 35 degree
C/cm, with the highest temperature at the top of the
crucible. Solidification was achieved by lowering the
system temperature at a rate of 4-5 degree C/min. The
second technique entailed lowering a silicon-loaded
carbon crucible through a fixed-rf coil at a rate of
0.55 cm\slash min. Crack-free silicon was produced by
both methods. The equilibrium grain structure was
initiated by nucleation at the crucible walls, with
surviving grains tending to grow in alignment with the
temperature gradient to produce an axially columnar
grain structure of mainly 110 orientation. The average
grain diameter was 0.11 cm; a typical length was 0.7
cm. Solar cells made with this material gave an AMI
conversion efficiency of 11.4\%.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8110F (Crystal growth from melt); A8630J
(Photoelectric conversion; solar cells and arrays);
B0510 (Crystal growth); B2550 (Semiconductor device
technology); B8420 (Solar cells and arrays)",
classification = "549; 702",
corpsource = "Photovoltaics Branch, Solar Energy Res. Inst., Golden,
CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "axially columnar grain structure; Bridgman; C
crucible; conversion efficiency; crystal growth from
melt; directional solidification; semiconductor growth;
semiconductors; silicon; silicon and alloys; solar
cells; solar cells --- Manufacture; static technique;
Stockbarger method",
treatment = "A Application; P Practical",
}
@Article{VanVechten:1979:ERN,
author = "J. A. {Van Vechten} and R. J. Gambino and J. J.
Cuomo",
title = "Encapsulation of Radioactive Noble Gas Waste in
Amorphous Alloy",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "278--285",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Public demand for the containment and safe storage of
radioactive waste materials has caused the U. S.
Government to require that, beginning in January 1983,
most of the **8**5Kr, which until now has been vented
to the atmosphere during the reprocessing of nuclear
fision fuel rods, will have to be captured and retained
for several decades. The cost of accomplishing this
with present compressed-gas technology is enough to
increase the cost of nuclear generated electricity by
an estimated 0.3\%. However, materials developed for
amorphous magnetic bubble memory devices have been
found to be capable of storing large quantities of Kr
(30 atomic percent) with great stability up to
temperatures above 1070 K. The cost of **8**5Kr storage
in the magnetic bubble memory material appears to be
less than 1\% of that for present compressed-gas
technology.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2842K (Radioactive wastes from fission reactors);
A2875 (Radioactive waste, transportation, disposal,
storage, treatment); A2880 (Radiation technology,
including shielding)B8220B (Nuclear reactors)",
classification = "622",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "/sup 85/Kr; air pollution control; air pollution
detection and control; alloys; amorphous; amorphous
alloy; cost; economics; encapsulation; fission reactor
materials; industrial wastes; krypton; magnetic bubble
memory material; radioactive materials --- Waste
Disposal; radioactive waste; radioactive waste storage;
state",
treatment = "P Practical",
}
@Article{Lorie:1979:ASL,
author = "Raymond A. Lorie and Jorgen F. Nilsson",
title = "Access Specification Language for a Relational Data
Base System",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "286--298",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper addresses the problem of executing high
level language queries submitted to a relational data
base system. As a step in the process of constructing
an ``efficient'' compiler for a high level language the
elaboration of an intermediate level language is
suggested, acting as a target language for the
optimizer part of the compiler. This language may be
conceived as one of several levels in a chain of
abstract machines mapping a nonprocedural relational
language onto primitive data base access operations.
The introduction of an access specification language is
intended to provide a conceptual platform facilitating
the handling of the ``optimization'' problem.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6140D (High level
languages); C6150C (Compilers, interpreters and other
processors); C6160D (Relational databases)",
classification = "723",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access specification language; compiler; computer
operating systems --- Program Compilers; computer
programming languages; data base systems; database
management systems; high level language; intermediate
level language; language; nonprocedural relational;
problem oriented languages; program compilers;
relational data base system",
treatment = "P Practical",
}
@Article{Blahut:1979:TTE,
author = "R. E. Blahut",
title = "Transform Techniques for Error Control Codes",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "299--315",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94B05 (94B15)",
MRnumber = "80f:94014",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "By using the theory of finite field Fourier
transforms, the subject of error control codes is
described in a language familiar to the field of signal
processing. The many important uses of spectral
techniques in error control are summarized. Many
classes of linear codes are given a spectral
interpretation and some new codes are described.
Several alternative encoder\slash decoder schemes are
described by frequency domain reasoning. In particular,
an errors-and-erasures decoder for A BCH code is
exhibited which has virtually no additional
computations over an errors-only decoder. Techniques
for decoding BCH, RS, and alternant codes (Goppa codes)
a short distance beyond the designed distance are
discussed. Also, a modification to the definition of a
BCH code is described which reduces the decoder
complexity without changing the code's rate or minimum
distance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0230 (Integral transforms); B6120B (Codes); C1130
(Integral transforms); C6130 (Data handling
techniques)",
classification = "723; 921",
corpsource = "IBM Federal Systems Div. Lab., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "BCH code; codes; codes, symbolic; decoder; decoding;
encoder; encoding; error control codes; error
correction codes; finite field Fourier transforms;
Fourier; frequency domain analysis; Goppa codes;
linear; mathematical transformations --- Fourier
Transforms; RS codes; transforms",
treatment = "T Theoretical or Mathematical",
}
@Article{Diaz:1979:ECA,
author = "A. F. Diaz and K. K. Kanazawa",
title = "Electrodes with Covalently Attached Monolayers",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "316--329",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Cyclic and second-harmonic AC voltammetry has been
used to study solution and solid state electrochemical
reactions on metal oxide surfaces chemically modified
with silyl derivatives of the type
SnO$_2$/Si(CH$_2$)$_3$NH(CH$_2$)$_x$NR$_1$R$_2$. The R
groups studied include pyrazoline derivatives,
tetrathiafulvalene, and ferrocene. Electrode effects on
solution redox reactions involving phenothiazine and
benzoquinone have also been compared using both
platinum electrodes and the chemically modified
electrodes. The results from the various approaches
used consistently indicate that the redox reactions are
slower on modified as opposed to unmodified electrode
surfaces.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8245 (Electrochemistry and electrophoresis)",
classification = "539; 702",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "benzoquinone; chemical reactions; chemically;
covalently attached monolayers; derivative;
electrochemical; electrochemical electrodes;
electrochemical reactions; electrochemistry ---
Measurements; electrode surfaces; electrodes;
ferrocene; metal oxide; modified electrodes;
phenothiazine; platinum electrodes; pyrazoline; redox
reactions; silyl derivatives;
SnO$_2$Si(CH$_2$)3/NH(CH$_2$)$_x$NR$_1$R$_2$; surfaces;
tetrathiafulvalene; voltammetry",
treatment = "X Experimental",
}
@Article{Freiser:1979:ZFC,
author = "M. J. Freiser",
title = "On the Zigzag Form of Charged Domain Walls",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "330--338",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Unusual domain walls have been found in ferrofluid
patterns on thin film materials with low magnetization
that is in or near the plane of the film. These walls
carry a net magnetic charge and are characteristically
kinked in a regular manner to form a zigzag. A simple
account is given of the energetics of such walls whose
form follows from a compromise between magnetostatic
terms and the energy of anisotropy. It is argued that
an array of closure domains at straight edges in these
materials should have a boundary of similar character,
and these too have been observed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7560C (Magnetic domain walls and domain structure);
B3110 (Magnetic materials)",
classification = "708",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array of closure domains; domain walls; energy of
anisotropy; ferrofluid patterns; films; Gd-Co film; ion
implanted garnet; magnetic; magnetic charge; magnetic
domain walls; magnetic fluids; magnetic materials;
magnetic thin films; magnetostatic energy; thin film
materials; zigzag form",
treatment = "T Theoretical or Mathematical",
}
@Article{Nadas:1979:PP,
author = "Arthur Nadas",
title = "Probabilistic {PERT}",
journal = j-IBM-JRD,
volume = "23",
number = "3",
pages = "339--347",
month = may,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A solution is offered to the problem of determining a
probability distribution for the length of the longest
path from source (start) to sink (finish) in an
arbitrary PERT network (directed acyclic graph), as
well as determining associated probabilities that the
various paths are critical (``bottleneck
probabilities''). It is assumed that the durations of
delays encountered at a node are random variables
having known but arbitrary probability distributions
with finite expected values. The solution offered is,
in a certain sense, a worst-case bound over all
possible joint distributions of delays for given
marginal distributions for delays. This research was
motivated by the engineering problem of the timing
analysis of computer hardware logic block graphs where
randomness in circuit delay is associated with
manufacturing variations. The probability distribution
of the critical pathlength turns out to be a solution
of an unconstrained minimization problem, which can be
recast as a convex programming problem with linear
constraints. The probability that a given path is
critical turns out to be the Lagrange multiplier
associated with the constraint determined by the path.
The discrete version of the problem can be solved
numerically by means of various parametric linear
programming formulations, in particular by one which is
efficiently solved by Fulkerson's network flow
algorithm for project cost curves.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140Z (Other topics in statistics); C1180
(Optimisation techniques); C1290F (Systems theory
applications in industry)C4190 (Other numerical
methods)",
classification = "723; 922",
corpsource = "IBM Data Systems Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit delay; convex programming; cost curves;
critical path method; data processing; directed acyclic
graph; Fulkerson's network flow algorithm; linear;
linear programming; minimisation; PERT; probability;
probability distribution; programming; project;
unconstrained minimisation",
treatment = "T Theoretical or Mathematical",
}
@Article{Paivanas:1979:AFS,
author = "J. A. Paivanas and J. K. Hassan",
title = "Air Film System for Handling Semiconductor Wafers",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "361--375",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In an automated fabrication facility, the thin,
fragile silicon wafers in which semiconductor circuits
are formed must be transported to and from processing
stations with a minimum of contact with other solid
objects so as to minimize damage, contamination, and
consequent lowering of product yield. This task has
been undertaken for some time, by systems based on a
lubricating film of air as a means for levitating and
moving wafers. However, due to inherent motion
instabilities and specific control needs, some solid
contact is typically involved in effecting prescribed
wafer motion. The need for solid contact control is
greatly reduced by the air film system described in
this paper. It is based on a surface configuration that
combines two fluid mechanics phenomena to generate a
supporting air film that provides and guides wafer
motion. Wafer transportation and positioning are
achieved with the air film operating in conjunction
with special control device techniques.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B2550
(Semiconductor device technology); C3120C (Spatial
variables control); C3320 (Control applications to
materials handling)",
classification = "607; 691; 712; 714",
corpsource = "IBM Corp., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air film system; automated fabrication facility;
control; control device techniques; fluid mechanics;
materials handling; materials handling --- Lubrication;
pneumatic control equipment; position; positioning;
processing stations; semiconductor device manufacture;
semiconductor wafers; surface configuration; wafer
transportation",
treatment = "A Application",
}
@Article{Petersen:1979:MMS,
author = "K. E. Petersen",
title = "Micromechanical Membrane Switches on Silicon",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "376--385",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new class of electronic devices, micromechanical
membrane switches, has been developed. These switches
have operating characteristics that fill the gap
between conventional silicon transistors and mechanical
electromagnetic relays. Although they are batch
fabricated on silicon using conventional
photolithographic and integrated circuit processing
techniques, their unique properties allow them to
perform functions not ordinarily associated with
silicon. The devices are basically extremely small,
electrostatically controlled mechanical relays,
typically less than 100 $\mu$ m long. Their high off-to
on-state impedance ratio and all-metal conduction paths
make them ideally suited for AC signal switching
arrays. This paper describes the design, fabrication,
operating behavior, and potential applications of these
voltage-controlled, micromechanical switches.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2180B (Relays and switches)",
classification = "712; 714",
corpsource = "IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AC signal switching arrays; design; electrostatically
controlled mechanical; fabrication; impedance ratio;
integrated circuit processing; membranes;
micromechanical membrane switches; operating
characteristics; photolithographic techniques;
photolithography; relays; semiconducting silicon;
semiconductor devices; silicon; switches; techniques",
treatment = "N New Development",
}
@Article{Lee:1979:ABD,
author = "H. C. Lee and J. W. Raider",
title = "An application of beam dynamics to a damper design",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "386--391",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Flexural wave propagation may be used as a means of
absorbing impact energy to prevent excessive rebound or
to shorten the cycle time of high-speed printing
devices. For optimal damping action, however, the
dynamic analysis of beams used in the mechanism is
necessary; this paper presents such an analysis. It
also presents an application of damper ring design that
is used to prevent so-called ``shadow printing'' by
suppressing the rebound of the type elements in a disk
printer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "722; 745",
corpsource = "IBM Corp., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "beam dynamics; computer peripheral equipment; damper
ring design; damping; disc printer; dynamic analysis;
printers; printing machinery --- Antivibration
Mountings; rebound",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Meier:1979:IDP,
author = "J. H. Meier and J. W. Raider",
title = "Interposer for Disk Printer",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "392--395",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In an impact printer which selects characters by
having a hammer hit type elements as they travel at
constant velocity past the print location, a
significant design problem results from the requirement
that the hammer hit only the selected character. In the
usual configuration this requirement limits printing
speed because the hammer penetrates the plane of the
moving type elements and spends a sufficient time in
this plane to risk collision with an adjacent type
element. This paper describes, for printers with widely
separated hammers, a technique to effectively eliminate
the ``in-plane'' time. A cammed interposer is used to
transfer most of the kinetic energy of the type
element, with the remaining energy being absorbed in
strain energy of the interposer. For one printer, this
technique resulted in an increase in the printing speed
from 15 to 30 characters per second.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "745",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cammed interposer; disc printer; hammer; impact
(mechanical); impact printer; kinetic energy; printers;
printing speed; strain energy; type elements;
typewriters",
treatment = "A Application; P Practical",
}
@Article{Zable:1979:CPE,
author = "J. Zable",
title = "Cylindrical Print Element System for a Serial Impact
Printer",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "396--402",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "For an impact serial printer, like a typewriter
terminal, it is desirable to print fast and to print
with a minimum of maintenance. For printing to take
place, the carrier containing the print element must be
in the correct position along the print line and the
character selection must be made by the proper
positioning of the print element. This paper discusses
a cylindrical thin-walled print element containing an
entire character array on its outside surface. The
print element is rotated and translated independently
by two prime movers (motors). The cylindrical print
element geometry and the prime movers are optimized to
minimize the time required for character selection.
Surface area, stress, inertia, torque, and motor
requirements are considered. Selection times and
printing rates are computed for simulated printing
conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "745",
corpsource = "IBM Corp., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "character array; character selection; cylindrical
print element system; impact (mechanical); motor
requirements; printers; printing rates; serial impact
printer; typewriter terminal; typewriters",
treatment = "P Practical",
}
@Article{Engel:1979:DRP,
author = "P. A. Engel and H. C. Lee and J. L. Zable",
title = "Dynamic Response of a Print Belt System",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "403--410",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The dynamic response of a print belt system, when the
print belt is subjected to impulsive print forces, is
analyzed in this paper. The system consists of a flat
steel print belt tightly wrapped around pulleys with
one of the pulleys driven by a motor. Analytical
modeling allows the prediction and analysis of belt
motion and thus the prediction of print
misregistration. Discrete parameters used in the
analysis permit simulation of the belt motion as
affected by variations in belt tension, stiffness,
pulley inertias, and motor-operating parameters.
Conditions of belt slippage are examined, as well as
the effect of dynamic loading upon the drive motor.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "705; 745",
corpsource = "IBM Corp., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "belt motion; belt slippage; dynamic loading; dynamic
response; electric motors, stepping type; impulsive
print forces; motor; print belt system; print
misregistration; printers; pulleys; simulation;
typewriters",
treatment = "T Theoretical or Mathematical",
}
@Article{Helinski:1979:HRS,
author = "E. F. Helinski",
title = "Harmonic-Drive Ribbon Stuffer for Impact Printers",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "411--414",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a harmonic-motion ribbon-stuffing
device for impact printers, which maintains a
consistent placement pattern for large-capacity (120
yards) endless-loop fabric ribbons. The ribbon is
uniformly placed into a cavity by eccentric drive rolls
that ensure alternate ribbon switching due to the
geometric relationship drive rolls and strippers. The
ribbon is positively placed in a manner much like a
fixed-displacement drive, thus differing significantly
from the principle used by existing ribbon packers,
which achieve ribbon placement by balancing the
difference in net driving force against the buckling
resistance of the ribbon.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C5550 (Printers, plotters and
other hard-copy output devices)",
classification = "745",
corpsource = "IBM Corp., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cavity; consistent placement; drives; eccentric drive
rolls; harmonic motion; impact (mechanical); impact
printers; printers; ribbon stuffer; strippers;
typewriters",
treatment = "P Practical",
}
@Article{Clark:1979:DSM,
author = "William D. Clark",
title = "Document Scanner Mechanism",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "415--423",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A document scanner mechanism, developed for use in a
conventional copier, having mirrors which scan a
document and reflect the image onto a rotating
photoconductor drum, is described in this paper. The
engineering design and operation of the mechanism are
presented, and the development of an analytical model
for simulating its operational characteristics is
described, together with the results and conclusions of
the simulation. A novel means of generating the scan
motion and the important design considerations leading
to the development of the scanner mechanism are also
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3350L (Control applications in printing and
associated industries); C7230 (Publishing and
reproduction)",
classification = "741; 745; 912",
corpsource = "IBM Corp., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "business machines; copier; design engineering;
document scanner mechanism; engineering design;
operational characteristics; photocopying; photographic
reproduction; scan motion; simulation",
treatment = "P Practical",
}
@Article{Taylor:1979:PES,
author = "Russel H. Taylor",
title = "Planning and Execution of Straight Line Manipulator
Trajectories",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "424--436",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recently developed manipulator control languages
typically specify motions as sequences of points
through which a tool affixed to the end of the
manipulator is to pass. The effectiveness of such
motion specification formalisms is greatly increased if
the tool moves in a straight line between the
user-specified points. This paper describes two methods
for achieving such straight line motions. The first
method is a refinement of one developed in 1974 by R.
Paul. Intermediate points are interpolated along the
Cartesian straight line path at regular intervals
during the motion, and the manipulator's kinematic
equations are solved to produce the corresponding
intermediate joint parameter values. The path
interpolation functions thus developed offer several
advantages, including less computational cost and
improved motion characteristics. The second method uses
a motion planning phase to precompute enough
intermediate points so that the manipulator may be
driven by interpolation of joint parameter values while
keeping the tool on an approximately straight line
path. This technique allows a substantial reduction in
real time computation and permits problems arising from
degenerate joint alignments to be handled more easily.
The planning is done by an efficient recursive
algorithm which generates only enough intermediate
points to guarantee that the tool's deviation from a
straight line path stays within prespecified error
bounds.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3320 (Control applications to materials handling);
C7420 (Control engineering computing)",
classification = "731",
corpsource = "IBM Corp., Boca Raton, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Cartesian straight line path; computerised materials
handling; control, mechanical variables; equations;
intermediate points; interpolation; interpolation of
joint parameter values; kinematic; languages;
management; manipulator control; motion planning;
recursive algorithm; straight line manipulator
trajectories; systems science and cybernetics ---
Artificial Intelligence",
treatment = "A Application",
}
@Article{Bogy:1979:NES,
author = "D. B. Bogy and J. E. Fromm and F. E. Talke",
title = "Numerical and Experimental Study of the
Bistable-Unstable Transition in Pressurized Flexible
Disk Files",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "437--449",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The bistable operating region of flexible disk files
is limited at decreasing air flow rates by a transition
at which undesirable gaps appear in the otherwise
uniformly spaced disks of the pack. These spontaneous
gaps, as opposed to the externally controlled gaps of
the bistable range, are a consequence of local air flow
fields at the outer edge of the disks. Experiments with
external shrouds of various clearance showed axial
periodicity in the occurrence of the gaps and provided
physical insight which led to quantitative numerical
solution of the nonlinear fluid equations. Two scales
of the flow, i.e., the flow between individual disks
and a peripheral unstable Couette flow, are found to
couple in such a manner as to delineate the
transition.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290K (Nonlinear and functional equations); B3120B
(Magnetic recording); C1320 (Stability in control
theory); C4150 (Nonlinear and functional equations);
C5320C (Storage on moving magnetic media); C5320
(Digital storage)",
classification = "912",
corpsource = "Univ. of California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "axial periodicity; bistable/unstable transition;
business machines; Couette flow; equations; external
shrouds; files; local air flow fields; magnetic disc
and drum storage; nonlinear; nonlinear fluid; numerical
solution; peripheral unstable Couette flow; pressurised
flexible disc; spontaneous gaps; stability",
treatment = "A Application; X Experimental",
}
@Article{Bogy:1979:EDC,
author = "D. B. Bogy and N. Bugdayci and F. E. Talke",
title = "Experimental Determination of Creep Functions for Thin
Orthotropic Polymer Films",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "450--458",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Stringent requirements on the dimensional stability of
polymer films used as substrates for magnetic recording
make it necessary to experimentally determine their
anisotropic viscoelastic behavior. This paper deals
with the measurement of the time-dependent,
longitudinal elongation and lateral contraction of 50
multiplied by 900-mm biaxially longitudinal elongation,
and a laser-scanning technique is used for measuring
lateral contraction. Preliminary investigations are
carried out to determine the static Poisson's ratio, to
check the linearity of longitudinal creep with respect
to load, and to investigate the validity of the
time-temperature superposition hypothesis. In addition,
tests are described in which longitudinal and lateral
creep of the specimens are simultaneously measured
under constant loads in temperature-and
humidity-controlled environments. It is found that the
Poisson's ratio has only a weak dependence on time,
and, therefore, a good approximation may be obtained by
treating the Poisson's ratio as independent of time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics (engineering materials
science))B0590 (Materials testing); B3120B (Magnetic
recording); B7320Z (Other nonelectric variables
measurement)",
classification = "815; 817",
corpsource = "Univ. of California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "by laser beam; creep functions; creep testing;
elongation; lateral contraction; longitudinal
elongation; magnetic recording; measurement;
orthotropic polyethylene terephthalate; plastic films
--- Stability; Poisson ratio; polymer films; polymers;
strips",
treatment = "X Experimental",
}
@Article{Marinace:1979:TSE,
author = "J. C. Marinace",
title = "Tunnels in semiconductor epitaxy",
journal = j-IBM-JRD,
volume = "23",
number = "4",
pages = "459--461",
month = jul,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
B0510D (Epitaxial growth)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "grooves; growth; phase epitaxial growth; semiconductor
epitaxial layers; semiconductor epitaxy; semiconductor
growth; tunnels; vapour",
treatment = "P Practical",
}
@Article{Sorokin:1979:CIL,
author = "P. P. Sorokin",
title = "Contributions of {IBM} to laser science-1960 to the
present",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "476--489",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4260 (Laser systems and laser beam applications);
B4320 (Lasers)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "laser applications; laser science; lasers; reviews",
treatment = "G General Review",
}
@Article{Wynne:1979:SBA,
author = "J. J. Wynne and J. A. Armstrong",
title = "Systematic Behavior in Alkaline Earth Spectra: a
Multichannel Quantum Defect Analysis",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "490--503",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "``Two-electron'' atoms are more complex than
``one-electron'' atoms because of electron-electron
interactions. This leads to spectra that are not well
understood. Using multiple photon excitation and
ionization detection, the authors have extensively
studied Rydberg series of states in Ca, Sr, and Ba. The
spectroscopic data were interpreted by using
multichannel quantum defect theory (MQDT). In this
context, systematic trends in the atom series Ca, Sr,
and Ba are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3220 (Atomic spectra grouped by wavelength ranges);
A3280K (Multiphoton processes in atoms)",
classification = "549; 801",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alkaline earth metals; atomic; atomic spectra; Ba;
barium; Ca; calcium; excitation; ionization detection;
laser spectroscopy; many electron atoms; multichannel
quantum defect analysis; multiphoton spectra; multiple
photon; Rydberg series; spectra; Sr; strontium",
treatment = "X Experimental",
}
@Article{Loy:1979:TCT,
author = "M. M. T. Loy",
title = "Two-Photon Coherent Transients",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "504--516",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Two-photon mutation, free-induction decay, and
population inversion by adiabatic rapid passage have
been studied in NH$_3$. These effects are easily
visualized with a vector model. Relaxation times T$_1$
and T$_2$ have been measured.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4265G (Optical transient phenomena, self-induced
transparency, optical saturation and related effects)",
classification = "931; 952",
corpsource = "IBM Thomas J. Watson, Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adiabatic rapid passage; ammonia; buffer gas; free
induction decay; nutation; optical coherent; optical
coherent transients; photons; population inversion;
population relaxation time; quantum theory; transients;
two photon phase relaxation time; two photon vector
model",
treatment = "X Experimental",
}
@Article{Morawitz:1979:CEE,
author = "H. Morawitz",
title = "Cooperative Emission of an Excited Monolayer into
Surface Plasmons",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "517--526",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The cooperative emission of an excited molecular
monolayer into surface plasmons of a metallic substrate
is described. The effect arises from the very strong
coupling of an electronically excited molecule to
surface plasmons at distances that are short compared
to the wavelength of the electronic transition. Strong
resonant enhancement of this excited molecule-surface
plasmon interaction occurs for near-degeneracy of the
electronic transition frequency and the asymptotic
surface plasmon frequency $\omega_p/2^{1/2}$. It is
shown theoretically how the two-dimensional analogue of
superradiance can arise, leading to a highly
directional and very intense surface plasmon pulse.
This pulse or series of pulses has soliton-like
characteristics and may be expected to propagate for
considerably longer distances along the metal-vacuum
interface than do individual surface plasmons.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7145G (Exchange, correlation, dielectric and magnetic
functions, plasmons); A7320 (Electronic surface
states); A7845 (Stimulated emission (condensed
matter))",
classification = "741; 744",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "asymptotic surface plasmon; cooperative emission;
electron states; electronic transition; excited
molecular monolayer; frequency; lasers --- Theory;
light; metal dielectric interface; plasmons; polariton
modes; stimulated emission; superradiance; surface;
surface electron states",
treatment = "T Theoretical or Mathematical",
}
@Article{DeVoe:1979:SOF,
author = "R. G. DeVoe and R. G. Brewer",
title = "Subnanosecond Optical Free-Induction Decay",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "527--533",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A novel form of laser frequency switching is devised
that extends coherent optical transient studies to a
100-picosecond time scale, the measurements being
performed in real time. Free-induction decay (FID) on a
subnanosecond time scale reveals new features, such as
a first-order FID that dephases with the inhomogeneous
dephasing time T*$_2$ and interferes with the
well-known nonlinear FID. A complete analytical
expression for optical FID is derived and supports the
FID observations for the sodium D$_1$ transition.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4265G (Optical transient phenomena, self-induced
transparency, optical saturation and related effects)",
classification = "744; 941",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "detection; electrooptic phase modulator; free
induction decay; heterodyne; inhomogeneous dephasing
time; laser frequency switching; lasers; Na; optical
coherent transients; optical variables measurement;
subnanosecond time scale; travelling wave",
treatment = "T Theoretical or Mathematical",
}
@Article{Burland:1979:OTL,
author = "D. M. Burland and D. Haarer",
title = "One-And Two-Photon Laser Photochemistry in Organic
Solids",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "534--546",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The criteria for site-selective low-temperature laser
photochemistry in organic solids are discussed within a
general framework that includes both one-and two-photon
photochemical reaction schemes. Requirements are
identified for the use of this photochemistry in
photochemical hole burning applications such as
high-resolution spectroscopy and the study of
low-temperature reaction mechanisms. The one-and
two-photon reaction schemes are quite different from
one another with respect to excited state geometries nd
short-lived photoreactive intermediates. The reversible
tautomerism of quinizarin in hydrogen-bonded host
materials is studied as a one-photon example. The
photochemistry involves both intra-and intermolecular
hydrogen bonds. The photodissociations of s-tetrazine
(ST) and dimethyl-s-tetrazine (DMST) are studied as
examples of the two-photon reaction and a kinetic
scheme is proposed for the tetrazine case. The
intensity dependence of the photochemistry in solids is
modeled mathematically.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8250 (Photochemistry and radiation chemistry)",
classification = "741; 802; 804",
corpsource = "IBM Res. Div Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chemical reactions --- Photochemical Reactions;
dimethyl s-tetrazine; excited state; geometries;
H-bonded host materials; high; intensity dependence;
isomerisation; low temperature reaction; mechanisms;
molecular photodissociation; organic compounds; organic
solids; photochemical hole burning; photochemistry;
photodissociations; photoreactive intermediates;
quinizarin; resolution spectroscopy; reversible;
s-tetrazine; tautomerism; two photon laser
photochemistry",
treatment = "X Experimental",
}
@Article{Volker:1979:PHB,
author = "S. V{\"o}lker and R. M. Macfarlane",
title = "Photochemical Hole Burning in Free-Base Porphyrin and
Chlorin in {N}-Alkane Matrices",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "547--555",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In inhomogeneously broadened lines, selective
photochemistry with narrow band lasers leads to
photochemical hole burning. This phenomenon is
described with particular reference to free-base
porphyrin (H$_2$P) and chlorin molecules in n-alkane
matrices at low temperatures. It is shown that hole
burning, which is permanent at low temperatures, can be
used to study homogeneous optical dephasing processes
as a function of temperature, to measure fast vibronic
relaxation, and to assign complex vibronic spectra.
Some of the parameters that are important to the
potential use of photochemical hole burning for
information storage in inhomogeneously broadened lines
are measured and discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8250 (Photochemistry and radiation chemistry)",
classification = "741; 744; 801; 802",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "burning; chemical reactions; complex vibronic; fast
vibronic relaxation; free base chlorin; free base
porphyrin; homogeneous optical dephasing; information
storage; inhomogeneously broadened lines; n-alkane
matrices; narrow band lasers; photochemical hole;
photochemistry; processes; spectra; spectroscopy",
treatment = "X Experimental",
}
@Article{Bethune:1979:TIS,
author = "D. S. Bethune and J. R. Lankard and M. M. T. Loy and
P. P. Sorokin",
title = "Time-Resolved Infrared Spectral Photography: a New
Technique",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "556--575",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new technique for photographic or multichannel
photoelectric recording of broad band infrared
absorption spectra with approximately 5-ns time
resolution is described. The technique is based on
resonant four-wave mixing in alkali metal vapors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765G (IR spectroscopy and spectrometers); A0768
(Photography, photographic instruments and
techniques)",
classification = "801; 932",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alkali metal vapours; broad band infrared absorption
spectra; four wave mixing; infrared spectral
photography; multichannel photoelectric; photographic
applications; recording; resolved spectroscopy;
resonant; spectroscopy, absorption; spectroscopy,
infrared; time; time resolved spectroscopy",
treatment = "A Application; N New Development",
}
@Article{Crow:1979:GLR,
author = "J. D. Crow",
title = "{(GaAl)As} Laser Requirements for Local Attached Data
Link Applications",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "576--584",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The characteristics of (GaAl)As double heterostructure
stripe contact injection lasers as they relate to
applications in fiber optic data transmission systems
are reviewed. The laser characteristics are treated as
optical, electrical, thermal, and mechanical interfaces
to the system in order to emphasize the necessity of
designing devices as a functional part of a system or
subsystem. It is concluded that the laser is generally
well suited as an optical source in a card-mountable
hybrid module transmitter for data links up to a few km
and approximately equals 100 Mbit/s data rates. Areas
requiring further development include lowering of the
laser threshold current, improving the modal stability,
packaging the laser with electronics and fiber optic
transmission lines, and improving the laser lifetime
under varying ambient temperature conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255P (Lasing action in semiconductors); A4260B
(Design of specific laser systems); A4280S (Optical
communications devices); B4320J (Semiconductor lasers);
B6260 (Optical links and equipment)",
classification = "717; 744",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(GaAl)As; aluminium compounds; ambient; double
heterostructure; fibre optic data transmission; gallium
arsenide; hybrid module transmitter; III-V
semiconductors; laser; laser lifetime; lasers; lasers,
solid state; local attached data link; model stability;
optical communication equipment; optical source;
semiconductor function lasers; semiconductor junction;
stripe contact injection; telecommunication links,
optical; temperature conditions; threshold current",
treatment = "A Application; P Practical",
}
@Article{Lynch:1979:GLT,
author = "R. T. {Lynch, Jr.} and M. B. Small and R. Y. Hung",
title = "{GaAs\slash (GaAl)As} Laser Technology",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "585--595",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is a review of some recent work at IBM on
semiconductor injection lasers. An automated system has
been built and used for the epitaxial growth of laser
material, and the paper describes testing procedures
used to characterize this material. Results on the
degradation of these lasers at high continuous wave
optical power are also presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4255P (Lasing action in semiconductors); A8110D
(Crystal growth from solution); A8115L (Deposition from
liquid phases (melts and solutions)); B0510D (Epitaxial
growth); B4320J (Semiconductor lasers)",
classification = "744; 932",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aluminium compounds; continuous wave optical power;
crystals --- Epitaxial Growth; degradation;
GaAs-(GaAl)As; gallium arsenide; III-V semiconductors;
injection; junction lasers; lasers; lasers, solid
state; liquid phase epitaxial growth; reliability;
semiconductor; semiconductor junction lasers",
treatment = "G General Review",
}
@Article{Luntz:1979:MBL,
author = "A. C. Luntz",
title = "Molecular Beam Laser-Induced Fluorescence Studies of
Chemical Reactions",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "596--603",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Crossed molecular beam experiments that use
laser-induced fluorescence spectroscopy as the detector
allow measurements of the internal state distribution
in the products of chemical reactions studied under
well-controlled single-collision conditions. This
technique provides direct information on the chemical
dynamics and the intermolecular potential
surfaces. Application to the reactions H plus NO$_2$
yields OH plus NO and O(**3P) plus C$_6$H$_{12}$ yields
OH plus C$_6$H$_{11}$ is discussed where the OH state
distribution has been measured.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "741; 744; 802; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chemical reactions; fluorescence --- Laser
Applications; molecular beams --- Applications",
}
@Article{Pohl:1979:FRS,
author = "D. W. Pohl",
title = "Forced {Rayleigh} Scattering",
journal = j-IBM-JRD,
volume = "23",
number = "5",
pages = "604--614",
month = sep,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Forced Rayleigh scattering (FRS) is a light scattering
technique used to investigate light-induced grating
structures that decay in a relaxational or almost
relaxational manner. Such gratings can be created by
interference and absorption of two pump beams and
probed by a third beam, usually of different frequency.
They may consist of spatially varying excited state
populations with picosecond lifetimes or of long-lived
variations in temperature, composition, and\slash or
density. Forced Rayleigh scattering provides high
sensitivity with respect to the amplitude and dynamics
of such gratings and allows investigations not
accessible by classical scattering techniques. The
principles, techniques, and applications of FRS are
reviewed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7835 (Brillouin and Rayleigh scattering (condensed
matter))",
classification = "741; 744",
corpsource = "IBM Zurich Res. Div. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "absorption; excited state populations; forced Rayleigh
scattering; interference; lasers --- Theory; light;
light induced grating structures; pump beams; Rayleigh
scattering; relaxational decay; reviews; spatially
varying",
treatment = "G General Review",
}
@Article{Ruehli:1979:SCE,
author = "Albert E. Ruehli",
title = "Survey of Computer-Aided Electrical Analysis of
Integrated Circuit Interconnections",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "626--639",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In the last decade an important shift has taken place
in the design of hardware with the advent of smaller
and denser integrated circuits and packages. Analysis
techniques are required to ensure the proper electrical
functioning of this hardware. This paper gives a
coherent survey of the modeling and computer-aided
design techniques applicable to solving these problems.
Methods are considered for the computation of
resistances, capacitances, and inductances.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); C7410D
(Electronic engineering computing)",
classification = "703; 713; 714; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; circuit analysis computing; circuit CAD;
circuit layout CAD; computer aided circuit; electric
networks, active --- Computer Aided Analysis;
equivalent circuits; integrated circuit
interconnections; integrated circuits; large scale
integration",
treatment = "B Bibliography; G General Review; T Theoretical or
Mathematical",
}
@Article{Sakkas:1979:PDM,
author = "Constantine M. Sakkas",
title = "Potential Distribution and Multi-Terminal {DC}
Resistance Computations for {LSI} Technology",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "640--651",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "418.65064",
abstract = "Computer time and storage requirements are the two
main considerations in the design of a packaging
analysis software tool for the problem of calculating
the electric potential distribution in arbitrary
geometrical shapes. The FEM (Finite Element Method) is
the accepted approach for solving such problems. A new
formulation for the linear triangular element is
presented which is used to derive a very simple and
computationally inexpensive linear rectangular element
equation interrelating only the geometrical centers of
the elements. The result is a much sparser assembly
matrix with a maximum of five non-zero entries per
equation compared with the usual nine of the
formulation. In addition, a method to obtain the
minimum bandwidth of the matrix is given for the
efficient and static use of external storage,
permitting the solution of any size problem. The
methods are applicable to multi-plane, multi-terminal
configurations for the production of
equivalent-resistance networks and for the calculation
of the potential distribution throughout the
configurations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290F (Interpolation and function approximation);
B1130B (Computer-aided circuit analysis and design);
B2550G (Lithography); B2570 (Semiconductor integrated
circuits); C4130 (Interpolation and function
approximation); C7410D (Electronic engineering
computing)",
classification = "713; 714; 715; 921",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; circuit analysis computing; circuit CAD;
computer aided circuit analysis; computer storage
requirements; computer time requirements; electric
potential distribution; electronics packaging; finite
element; finite element method; integrated circuits ---
Large Scale Integration; large scale integration;
linear triangular element; mathematical techniques ---
Finite Element Method; multiterminal DC resistance;
packaging analysis software tool; resistance
computations",
treatment = "T Theoretical or Mathematical",
}
@Article{Weeks:1979:RIS,
author = "William T. Weeks and Leon Li-Heng Wu and Michael F.
McAllister and Ajit Singh",
title = "Resistive and Inductive Skin Effect in Rectangular
Conductors",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "652--660",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model based on network theory is presented for
calculating the frequency-dependent resistance and
inductance per unit length matrices for transmission
line systems consisting of conductors with rectangular
cross sections. The calculated results are compared
with actual measurements. Excellent agreement is
obtained over a wide range of frequencies, including
the mid-range where neither DC values nor
high-frequency limit values apply.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2110 (Conductors); B2120 (Resistors); B2140
(Inductors and transformers); B2160 (Wires and cables);
B5240 (Transmission line theory)",
classification = "704; 706; 714",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided circuit analyses; conductors
(electric); effect; electric conductors; electric lines
--- Mathematical Models; electric resistance;
frequencies; frequency dependent; frequency dependent
resistance; inductance; interchip wiring; midrange;
rectangular conductors; skin; skin effect; systems;
transmission line; transmission line theory; wiring",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Brennan:1979:TIC,
author = "Pierce A. Brennan and Norman Raver and Albert E.
Ruehli",
title = "Three-Dimensional Inductance Computations with Partial
Element Equivalent Circuits",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "661--668",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Inductance computations represent an important part in
the design of hardware packages, especially for high
performance computers. Partial element equivalent
circuits (PEEC) are used in this paper to investigate
two problems, viz., the inductance of ground plane
connections and the reduction in inductance due to eddy
currents set up in perpendicular crossing wires. The
results from the PEEC models are compared, for the
first problem, to experimental hardware measurements
and, in the second case, to simplified analytical
solutions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2140 (Inductors and transformers); B2160D (Cable
accessories); C7410D (Electronic engineering
computing)",
classification = "722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytical solutions; circuit analysis computing;
computations; computer hardware package design;
computers; computers, analog --- Circuits; computers,
digital; digital integrated circuits; eddy current;
effects; equivalent circuits; ground plane connections;
high performance; inductance; partial element
equivalent circuits; perpendicular crossing; three
dimensional inductance; wires",
treatment = "T Theoretical or Mathematical",
}
@Article{Weeks:1979:ESE,
author = "William T. Weeks",
title = "Exploiting Symmetry in Electrical Packaging Analysis",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "669--674",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "433.15004",
abstract = "Many properties of physical systems can be expressed
by symmetric matrices of order n, where n is the number
of components in the system. The computer storage
requirement for inverting the most general symmetric
matrix is n(n plus 1)/2 storage locations. For large
values of n, the number of multiplications required is
proportional to n**3. If the physical system possesses
certain geometrical symmetries, both the amount of
storage and the number of multiplications can be
reduced substantially. It is shown that if the physical
system possesses p orthogonal planes of symmetry, where
p equals 1, 2, or 3, and if n is sufficiently larger,
then the storage requirement can be reduced
approximately by 1/2**p and the number of
multiplications by 1/4**p.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B0210 (Algebra); B1130B
(Computer-aided circuit analysis and design); C1110
(Algebra)C7410D (Electronic engineering computing)",
classification = "715; 921",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit analysis computing; computer; electrical
packaging analysis; electronics packaging; inversion;
mathematical techniques --- Matrice Algebra; matrix;
matrix algebra; physical symmetry exploitation; storage
requirements; symmetric matrices",
treatment = "T Theoretical or Mathematical",
}
@Article{Gruodis:1979:TAU,
author = "Algirdas J. Gruodis",
title = "Transient Analysis of Uniform Resistive Transmission
Lines in a Homogeneous Medium",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "675--681",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Transient analysis of resistive transmission lines has
always been difficult. The need for this type of
analysis, however, did not become critical until
high-density circuit packaging became commonplace. This
paper discusses a method for the transient analysis of
resistive lines. It does not require a large number of
equivalent circuit elements, and yet it can be used to
represent a resistive line to any desired accuracy.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B5240 (Transmission line theory); C7410D (Electronic
engineering computing)",
classification = "703; 715",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit analysis computing; electric networks;
electrical; electronics packaging; homogeneous medium;
interchip wiring; large scale integration; LSI chips
packaging; packaging analysis; transient analysis;
transient response; transmission line theory; uniform
resistive transmission lines; wiring",
treatment = "T Theoretical or Mathematical",
}
@Article{Gaensslen:1979:GES,
author = "Fritz H. Gaensslen",
title = "Geometry Effects of Small {MOSFET} Devices",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "682--688",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The effects of diminishing MOS inversion channel
length or width on device characteristics are
discussed. As opposed to the geometric device size, an
``electric device size'' is established by normalizing
all dimensions on an appropriately chosen depletion
layer width. It is shown how this ``electric size''
governs the intensity of geometry effects. DC device
modeling methods are reviewed with respect to their
ease of application to electrically small devices.
Finally, means for reduction of geometry effects are
considered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560R (Insulated gate field effect
transistors); B2570F (Other MOS integrated circuits)",
classification = "714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "channel effects; DC modelling; device characteristics;
device size; electric device size; geometric; geometry
effects; insulated gate field effect transistors;
integration; large scale; narrow channel effects;
semiconductor device models; semiconductor devices,
mis; short; small MOSFET devices; transistors, field
effect",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Gillespie:1979:SLP,
author = "Sherry J. Gillespie",
title = "Stability of Lateral pnp Transistors During
Accelerated Aging",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "689--695",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Lateral pnp devices stressed under accelerated
temperature and voltage conditions show a degradation
in the transistor breakdown voltage. These results and
additional experiments that were conducted to better
understand the mechanisms involved in the observed
behavior are described. It was concluded that the
degradation can be related to a negative surface charge
in the base region of the transistor. This preliminary
finding has design and process implications for
potential improvement of bipolar device reliability in
applications that call for high voltages and low
epitaxial doping concentration.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B2560J (Bipolar transistors)",
classification = "714",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accelerated ageing; accelerated temperature and
voltage; ageing; base region; bipolar transistors;
breakdown voltage degradation high voltage devices;
charge; conditions; degradation; epitaxial doping
concentration; lateral pnp transistors; low; mechanism;
negative surface; process implications; reliability;
semiconductor devices --- Stability; stability; states;
surface; surface electron; transistor breakdown
voltage; transistors",
treatment = "X Experimental",
}
@Article{Coppersmith:1979:EPN,
author = "Don Coppersmith and D. T. Lee and Chak Kuen Wong",
title = "An Elementary Proof of Nonexistence of Isometries
Between $l_p^k$ and $l_q^k$",
journal = j-IBM-JRD,
volume = "23",
number = "6",
pages = "696--699",
month = nov,
year = "1979",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68C25 (46A45 46C10)",
MRnumber = "80i:68030",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "424.68026",
abstract = "For k equals 2, the two-dimensional coordinate spaces
$l_1^2$ and $l\infty^2$ are isometric. Consequently,
results on computational complexity for one space can
be transplanted to the other in a natural way. In this
note, an elementary proof is given for the nonisometry
between $l_p^k$ and $l_q^k$ for general $k$, $p$, and
$q$.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory)",
classification = "921",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computational complexity; coordinate spaces;
elementary proof; mathematical techniques;
multidimensional; nonisometry between spaces",
treatment = "T Theoretical or Mathematical",
}
@Article{Schmookler:1980:DLA,
author = "Martin S. Schmookler",
title = "Design of Large {ALUs} Using Multiple {PLA} Macros",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "2--14",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes methods of designing large
Arithmetic and Logical Units (ALUs) using multiple
Programmable Logic Array (PLA) macros in which the
outputs are obtained in one cycle corresponding to one
pass through any PLA. The design is based on the
well-known technique of providing conditional sums and
group carries in parallel and selecting the proper sum
using gating circuits. Several techniques are described
for optimizing one-pass PLA adders and for extending
previously published techniques to larger-width
adders.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5120 (Logic and switching
circuits); C5210 (Logic design methods)",
classification = "721; 723",
corpsource = "IBM General Systems Div. Lab., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "ALUs; Boolean; carry look ahead; computers --- Adders;
design method; EXOR circuits; integrated logic
circuits; large arithmetic and logic units; logic
design; multiple PLA macros; multiple programmable
logic array; operations; providing conditional; sum
using gating circuits; sums and group carries;
Weinberger adder",
treatment = "P Practical",
}
@Article{Eichelberger:1980:HTG,
author = "E. B. Eichelberger and E. Lindbloom",
title = "Heuristic Test-Pattern Generator for Programmable
Logic Arrays",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "15--22",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a heuristic method for generating
test patterns for Programmable Logic Arrays (PLAs).
Exploiting the regular structure of PLAs, both random
and deterministic test-pattern generation techniques
are combined to achieve coverage of crosre n is the
number of components in the system. The computer
storage requirement for inverting the most general
symmetric matrix is n(n plus 1)/2 storage locations.
For large values of n, the number of multiplications
required is proportional to n**3. If the physical
system possesses certain geometrical symmetries, both
the amount of storage and the number of multiplications
can be reduced substantially. It is shown that if the
physical system possesses p orthogonal planes of
symmetry, where p equals 1, 2, or 3, and if n is
sufficiently larger, then the storage requirement can
be reduced approximately by 1/2**p and the number of
multiplications by 1/4**p.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B1230G
(Function generators); B1265B (Logic circuits); B2570
(Semiconductor integrated circuits); C5120 (Logic and
switching circuits)",
classification = "715; 721; 723; 921",
corpsource = "IBM System Communications Div. Lab., Kingston, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computationally; cross point defects coverage;
electronics packaging; exploiting PLA regular;
generating test patterns; heuristic test pattern
generator; inexpensive; integrated circuit testing;
integrated logic circuits; logic; logic circuits; logic
design; mathematical techniques --- Matrice Algebra;
paths; PL/I program implementation; PLA testing;
programmable logic arrays; structure; test; testing",
treatment = "G General Review; P Practical",
}
@Article{Golden:1980:DAP,
author = "R. L. Golden and P. A. Latus and P. Lowy",
title = "Design Automation and the Programmable Logic Array
Macro",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "23--31",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper describes a chip design methodology which is
based on the use of PLA structures (or macros) within a
chip. Logic functions in array form are specified in a
compact notation that is automatically converted either
to array personalization patterns or to conventional
logic blocks for input to existing checking and testing
software. Simulation of any logic array is performed by
a single program subroutine operating on these
patterns.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210B (Computer-aided logic
design); C7410D (Electronic engineering computing)",
classification = "721; 723",
corpsource = "IBM System Communications Div. Lab., Kingston, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit layout CAD; computers, microprocessor ---
Design; design automation; integrated logic circuits;
logic CAD; logic design; PLA; programmable logic array
macro; simplifies LSI chip design",
treatment = "G General Review",
}
@Article{Patel:1980:ERS,
author = "Arvind M. Patel",
title = "Error Recovery Scheme for the {IBM 3850 Mass Storage
System}",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "32--42",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper presents a comprehensive scheme for error
recovery for the 3850 MSS which features a new
error-correction code in a serial, single-stripe data
format. The recovery procedure is designed around
resynchronizable sections of data which are rendered
independent of each other in error modes through the
use of zero-modulation encoding and self-contained
error-detection pointers. These error-detection
pointers and the resynchronization signals are utilized
in conjunction with interleaved codewords of the
error-correction code.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C5560 (Data
preparation equipment)",
classification = "723",
corpsource = "IBM General Products Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "code structure; codes, symbolic --- Error Correction;
data storage, digital; detection pointers; economical;
error correction code; error correction codes; error
recovery; IBM 3850 mass storage system; implementation;
interleaved codewords; magnetic tape recording;
magnetic tape storage; resynchronization signals;
scheme; self contained error",
treatment = "G General Review; N New Development",
}
@Article{Franaszek:1980:SBD,
author = "P. A. Franaszek",
title = "Synchronous Bounded Delay Coding for Input Restricted
Channels",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "43--48",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A24",
MRnumber = "81a:94025",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper treats the problem of constructing fixed
rate (synchronous) codes for the input restricted
channels subject to a constraint that the coding delay
be bounded by a parameter M. M is the maximum number of
information symbols required by the coder in choosing a
word during transmission.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
classification = "731",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "construction; encoding; finite state machines
modelling; information theory; input restricted
channels; synchronous bounded delay coding; synchronous
codes",
treatment = "T Theoretical or Mathematical",
}
@Article{Ahuja:1980:DDE,
author = "Vijay Ahuja",
title = "Determining Deadlock Exposure for a Class of Store and
Forward Communication Networks",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "49--55",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68A05 (68E10)",
MRnumber = "80i:68003",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of the deadlock for message buffers is
considered for store and forward communication networks
that have fixed routes for message transmission between
any two nodes. It is shown that a routed network is
exposed to deadlock if and only if there exists a
complete weighted matching of an appropriately defined
bipartite graph for some subgraph of the network graph.
An approach for determining whether a deadlock can
occur is presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); B6120B (Codes);
B6210L (Computer communications); C1160 (Combinatorial
mathematics); C5600 (Data communication equipment and
techniques)",
classification = "723",
corpsource = "IBM System Communications Div. Lab., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "complete weighted matching; computer networks;
deadlock exposure; determination; graph theory; network
graph; packet switching; pocket switching; routed
networks; store and forward communication networks",
treatment = "T Theoretical or Mathematical",
}
@Article{Lin:1980:COS,
author = "Shu Lin and George Markowsky",
title = "On a Class of One-Step Majority-Logic Decodable Cyclic
Codes",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "56--63",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94B15",
MRnumber = "80i:94015",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A class of one-step majority-logic decodable codes is
investigated. A method of decoding these codes has been
presented. Combinatorial expressions for determining
the dimensions of these codes have been derived. These
codes are effective compared with other majority-logic
decodable codes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B6120B (Codes)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "codes, symbolic; decodable codes; decoding; error
correction codes; high speed digital data transmission
systems; majority logic; majority logic decodable
cyclic codes; one step",
treatment = "T Theoretical or Mathematical",
}
@Article{Wesley:1980:GMS,
author = "M. A. Wesley and T. Lozano-Perez and L. I. Lieberman
and M. A. Lavin and D. D. Grossman",
title = "Geometric Modeling System for Automated Mechanical
Assembly",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "64--74",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper describes a computer-based system for
modeling three-dimensional (3-D) objects. The system
generates a data base in which objects and assemblies
are represented by nodes in a graph structure. The
edges of the graph represent relationships among
objects such as part-of, attachment, constraint, and
assembly. The nodes also store positional relationships
between objects and physical properties such as
material type. The user designs objects by combining
positive and negative parameterized primitive volumes,
for example, cubes and cones, which are represented
internally as polyhedra.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering computing)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "assembling; automated mechanical assembly; computer
simulation; digital simulation; geometric modelling
system; high level programming languages; material
type; mechanical assemblies; modelling; parameterized
primitive volumes; positional relationships; three
dimensional objects; very",
treatment = "G General Review",
xxauthor = "M. A. Wesley and L. I. Lieberman and M. A. Lavin and
D. D. Grossman and T. Lozano-Perez",
}
@Article{Chung:1980:CPR,
author = "K. M. Chung and F. Luccio and C. K. Wong",
title = "On the Complexity of Permuting Records in Magnetic
Bubble Memory Systems",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "75--84",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of permuting records in various simple
models of magnetic bubble memories is studied. Several
simple models are proposed with numbers of switches
ranging between 1 and n and respective time
complexities and respective numbers of control states
are analyzed for some permutation algorithms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120L (Magnetic bubble domain devices); C5320E
(Storage on stationary magnetic media); C6120 (File
organisation)",
classification = "721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "complexities; control states; data storage, magnetic;
file organisation; magnetic bubble devices; magnetic
bubble memory systems; magnetic film; permuting
records; stores; time",
treatment = "T Theoretical or Mathematical",
}
@Article{Pole:1980:IWM,
author = "R. V. Pole and A. J. Spiekerman and T. W. Hansch",
title = "Interferometric Wavelength Measurements Through
Post-Detection Signal Processing",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "85--88",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Modern electronic signal processing techniques make it
possible to use a conventional scanning Fabry-Peror
interferometer for highly accurate measurement of
(tunable) laser wavelengths. An experimental device is
described in which the time intervals between
resonances of an unknown wavelength are compared with
those of a stabilized He-Ne reference laser by the use
of highly accurate electronic timing devices. The
accuracy is further enhanced through signal averaging
over many scan periods.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0760L (Optical interferometry); A4230 (Optical
information, image formation and analysis); A4260H
(Laser beam characteristics and interactions); B4330
(Laser beam interactions and properties); B6140C
(Optical information, image and video signal
processing); B7320P (Optical variables measurement)",
classification = "744; 941; 942",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "10/sup -; 7/ accuracy; detection signal processing;
devices; electronic signal processing; experimental
device; frequency measurement; He-Ne reference laser;
highly accurate electronic timing; highly accurate
measurement; interferometer; interferometers;
interferometric wavelength measurements; laser beams;
lasers --- Testing; light interferometry; optical
variables measurement; post; scanning Fabry Perot;
signal averaging; signal processing; stabilized;
tunable laser wavelengths; wavelength measurement;
wavemeters",
treatment = "N New Development; X Experimental",
}
@Article{Braunecker:1980:POU,
author = "B. U. Braunecker",
title = "Pattern Optimization for {UPC} Supermarket Scanner",
journal = j-IBM-JRD,
volume = "24",
number = "1",
pages = "89--94",
month = jan,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Different scanning patterns chi are analyzed in order
to determine the degree of redundancy. To this purpose,
the number of resolution points is evaluated which are
generated by a sweeping laser beam, while the
merchandise is moved across the scanning window. The
goal is to find the pattern which minimizes $N_\chi$
for an acceptable detection rate.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4360 (Laser applications)",
classification = "741; 922",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bar code scanner; laser beam applications; optical;
pattern recognition systems; probability; redundancy;
scanning pattern optimisation; sweeping laser beam;
universal product code; UPC supermarket scanner",
treatment = "T Theoretical or Mathematical",
}
@Article{Anacker:1980:JCT,
author = "W. Anacker",
title = "{Josephson} Computer Technology: an {IBM} Research
Project",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "107--112",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper traces the origins and history of Josephson
technology as it led to the project and outlines the
project's scope. The potential of the technology for
ultrahigh-performance computer mainframes is discussed
and the major technological characteristics of LSI
Josephson devices are examined. The paper then provides
an overview outline of the remaining papers presented
in this issue.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B3240C (Superconducting
junction devices)",
classification = "704; 721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer technology; computers --- Circuits; Josephson
effect; junction devices; large scale integration;
logic circuits; LSI Josephson devices; superconducting;
superconducting devices",
treatment = "G General Review",
}
@Article{Matisoo:1980:OJT,
author = "J. Matisoo",
title = "Overview of {Josephson} Technology Logic and Memory",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "113--129",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Basic concepts of superconductivity and electron
tunneling underlying the operation of Josephson devices
are outlined and an overview of the literature on the
subject is presented, with emphasis on work performed
at the IBM research laboratories since the beginnings
of the Josephson computer technology program in 1965.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B1265D (Memory circuits);
B3240C (Superconducting junction devices)",
classification = "704; 722; 723; 921",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers --- Circuits; electron tunneling; integrated
logic circuits; integrated memory circuits; Josephson
devices; Josephson effect; junction devices; logic
circuits; memory circuits; superconducting;
superconducting devices; superconducting junction
devices",
treatment = "G General Review",
}
@Article{Gheewala:1980:DJC,
author = "T. R. Gheewala",
title = "Design of 2.5-Micrometer {Josephson} Current Injection
Logic (Cil)",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "130--142",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design of the basic logic circuits, the two-and
four-input OR and AND gates, and a timed inverter
circuit, is presented in full detail and the logic
delay and its sensitivity to design and fabrication
parameters are investigated using detailed models of
devices based on a 2.5- $\mu$ m technology. The nominal
logic delay of the circuits is estimated at 36 ps per
gate for an average fan-in of 4.5 and fan-out of 3. The
corresponding average power dissipation is 3.4
microwatts per gate. Finally, experimental delay
measurements are presented for two-input and four-input
OR and AND gates. The delay experiments are in
excellent agreement with computer simulations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B3240C (Superconducting
junction devices); C5120 (Logic and switching
circuits)",
classification = "704; 721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AND gates; average; computers --- Circuits; integrated
logic circuits; integration; Josephson current
injection logic; Josephson effect; large scale; logic
circuits; logic delay; LSI; OR gates; power
dissipation; superconducting devices; superconducting
junction devices; timed inverter circuit",
treatment = "P Practical; X Experimental",
}
@Article{Faris:1980:BDJ,
author = "S. M. Faris and W. H. Henkels and E. A. Valsamakis and
H. H. Zappe",
title = "Basic Design of a {Josephson} Technology Cache
Memory",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "143--154",
month = mar,
year = "1980",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.242.0143",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper, presenting a design for a 2.5- $\mu$ m
technology, 4 multiplied by 1K-bit cache chip with a
nominal access time of about 500 ps as a basis it is
shown how these components are structured and
interfaced. The cell, drivers, decoder, and a sense bus
are based on designs which were experimentally verified
in a 5- $\mu$ m technology for which excellent
agreement was found between computer simulations and
measurements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B3240C (Superconducting
junction devices)",
classification = "704; 721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cache memory; computers --- Circuits; integrated
memory circuits; integration; Josephson effect;
Josephson technology; junction devices; large scale;
logic circuits; nondestructive read out; nondestructive
readout; superconducting; superconducting devices",
treatment = "P Practical",
}
@Article{Gueret:1980:IJC,
author = "P. Gueret and A. Moser and P. Wolf",
title = "Investigations for a {Josephson} Computer Main Memory
with Single-Flux-Quantum Cells",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "155--166",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper first summarizes requirements for a main
memory with Josephson junctions and reviews the work
carried out on an experimental main memory model
containing an array of single-flux-quantum cells, line
drivers, and address decoders with a total of nearly
4500 Josephson junctions. In the second part,
theoretical and experimental investigations on the y
drive system, including sense circuit, are presented.
The investigations deal with both the read and write
phases. Finally, the on-chip logic circuits and the
address decoders are discussed, and the experimental
results presented. Drivers and decoders based on the
principle of current steering in superconducting loops
are intended to be used on a fully populated
main-memory chip.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B3240C (Superconducting
junction devices); C5320Z (Other digital storage)",
classification = "704; 721; 722; 723",
corpsource = "IBM Switzerland, Zurich, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access time; address; cellular arrays; computers ---
Circuits; decoders; effect; integrated memory circuits;
Josephson; large scale integration; line drivers; logic
circuits; LSI; power consumption; RAM; random-access
storage; single flux quantum cellular array;
superconducting devices; superconducting junction
devices",
treatment = "P Practical; X Experimental",
}
@Article{Brown:1980:OJP,
author = "Alan V. Brown",
title = "An Overview of {Josephson} Packaging",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "167--171",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An overall packaging philosophy for high-speed
Josephson computers is outlined in this paper. The
unique characteristics of such a package, operating at
liquid helium temperature, are described, and a
description is given of the technologies needed to
build the package.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B1265B (Logic circuits);
B1265D (Memory circuits); B3240C (Superconducting
junction devices); C5420 (Mainframes and
minicomputers)",
classification = "704; 721; 722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cache memory; capability; computers --- Circuits;
cycle time; digital computers; electronics packaging;
high speed Josephson computers; logic; main memory;
minimum linewidth; modules; modules configuration;
superconducting devices; superconducting junction
devices",
treatment = "P Practical",
}
@Article{Jones:1980:CCS,
author = "H. C. Jones and D. J. Herrell",
title = "The Characteristics of Chip-To-Chip Signal Propagation
in a Package Suitable for Superconducting Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "172--177",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Authors have measured the electrical characteristics
of chip-to-chip-carrier connectors ideally suited to
high-performance Josephson LSI circuits. Self-and
mutual inductances between connectors were measured by
incorporating the connectors in a DC SQUID
(Superconducting Quantum Interference Device) and
confirmed by detailed signal delay and crosstalk
measurements made with Josephson logic circuits.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B1265B (Logic circuits);
B3240C (Superconducting junction devices)",
classification = "704; 721; 722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chip to chip carrier; computers --- Circuits;
connectors; crosstalk measurements; DC SQUID; effect;
electric connectors; integrated logic circuits;
Josephson; Josephson LSI circuits; junction devices;
large scale integration; logic circuits; mutual
inductances; packaging; self inductance measurement;
signal delay; superconducting; superconducting
devices",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Broom:1980:MCJ,
author = "R. F. Broom and W. Kotyczka and A. Moser",
title = "Modeling of Characteristics for {Josephson} Junctions
Having Nonuniform Width or {Josephson} Current
Density",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "178--187",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The characteristics of a wide variety of junction
shapes, including interferometers having two or more
junctions, have been accurately calculated, permitting
the design of devices for specific purposes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7450 (Superconductor tunnelling phenomena, proximity
effects, and Josephson effect); B3240C (Superconducting
junction devices)",
classification = "704; 721; 922",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers --- Circuits; dynamic models; effect;
external magnetic field; inductance; interferometers;
Josephson; Josephson effect; logic circuits; maximum DC
Josephson current; static models; superconducting
devices; superconducting junction devices; tunnel
junctions",
treatment = "T Theoretical or Mathematical",
xxauthor = "R. F. Broom and A. Moser and W. Kotyczka",
}
@Article{Ames:1980:OMP,
author = "I. Ames",
title = "Overview of Materials and Process Aspects of
{Josephson} Integrated Circuit Fabrication",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "188--194",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Superconducting Pb-alloy thin films are used for
forming the junction electrodes, and a combination of
thermal and RF oxidation is used for forming the tunnel
barrier oxides. In addition to the junctions, the
circuits, which are formed above an insulated,
superconducting Nb ground plane, also contain:
superconducting Pb-alloy lines, contacts, and
transformers; AuIn$_2$ damping and terminating
resistors; insulated crossings; etc. Insulation between
the ground plane and overlying conducting layers is
achieved through use of a combination of Nb$_2$O$_5$
and SiO. The latter is also used to achieve insulation
between overlying conducting layers and as a final
protective coating. Photoresist processes are used for
layer patterning.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B3240C (Superconducting junction
devices)",
classification = "704",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "active elements; AuIn$_2$ resistors; crossings;
insulated; integrated circuit manufacture; integrated
circuit technology; integrated circuits; Josephson
effect; Josephson junctions; junction electrodes; layer
patterning; oxidation; oxides; Pb-alloy thin films;
photoresists; RF; superconducting devices;
superconducting junction devices; superconducting Nb
ground plane; thermal oxidation; tunnel barrier",
treatment = "P Practical",
}
@Article{Greiner:1980:FPJ,
author = "J. H. Greiner and C. J. Kircher and S. P. Klepner and
S. K. Lahiri and A. J. Warnecke and S. Basavaiah and J.
M. Baker and P. R. Brosious and H.-C. W. Huang and M.
Murakami and I. Ames and E. T. Yen",
title = "Fabrication Process for {Josephson} Integrated
Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "195--205",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the fabrication process used to
prepare recent Josephson devices and circuits. The
multilayer, integrated circuits were formed on oxidized
Si substrates primarily through use of vacuum-deposited
thin films. Superconducting layers were generally Pb
alloys and insulation layers, SiO. These layers were
patterned using photoresist stencil lift-off methods
and optical lithography with minimum linewidths of 2.5
$\mu$ m. An overview of the fabrication process is
presented, and preparation and properties of the
various layers are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B3240C (Superconducting junction
devices)",
classification = "704; 713; 721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AuIn$_2$ resistors; circuits; computers --- Circuits;
controls; damping resistors; device geometry;
electrodes; integrated circuit manufacture; integrated
circuit technology; interferometer; Josephson effect;
Josephson integrated circuits; junction; layer
patterning; logic circuits; memory; minimum linewidths;
photoresist stencil lift off; photoresists; SiO films;
sputter etching; subtractive etching; superconducting
devices; superconducting junction devices; tunnel
barrier formation; vacuum deposited Pb-alloy",
treatment = "P Practical",
xxauthor = "J. H. Greiner and C. J. Kircher and S. P. Klepner and
S. K. Lahiri and A. J. Warnecke and S. Basavaiah and E.
T. Yen and John M. Baker and P. R. Brosious and H. C.
W. Huang and M. Murakami and I. Ames",
}
@Article{Broom:1980:EPV,
author = "R. F. Broom and R. Jaggi and Th. O. Mohr and A.
Oosenbrug",
title = "Effect of Process Variables on Electrical Properties
of {Pb}-alloy {Josephson} Junctions",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "206--211",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Studies on the effect of process variables on the
electrical properties of Josephson tunnel junctions
were directed toward optimization of the process for
cryogenic memory applications, for which special
importance is placed on the DC Josephson current
density j$_1$, its stability and reproducibility, and
the junction quality. Variables studied included RF
voltage, oxygen plasma pressure, the presence of oxygen
during deposition of the counter electrode, the
composition and surface state of the base electrode,
junction geometry, radial position on the wafer, and
storage and annealing conditions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7450 (Superconductor tunnelling phenomena, proximity
effects, and Josephson effect); B3240C (Superconducting
junction devices)",
classification = "704",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealing factors; base electrode; characteristics;
counter electrode; cryogenic memory applications; DC;
devices; Josephson current density; Josephson effect;
junction geometry; lead alloys; O plasma pressure;
Pb-alloy Josephson junctions; Pb-Au-In alloys; radial
wafer position; RF voltage; superconducting devices;
superconducting junction; tunnel",
treatment = "X Experimental",
}
@Article{Broom:1980:FPN,
author = "R. F. Broom and Th. O. Mohr and W. Walter and R. B.
Laibowitz",
title = "Fabrication and Properties of Niobium {Josephson}
Tunnel Junctions",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "212--222",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The main emphasis is on improvement of the tunneling
characteristics through studies of the conditions
influencing the formation of the tunnel barrier. In
situ ellipsometric measurements have been made during
growth of the tunnel oxide on the base electrode of the
junctions in an RF plasma. The results are compared
with electrical measurements on completed junctions.
Two additional processes are found to have an important
influence on the junction characteristics: precleaning
of the base electrode in an Ar plasma before oxidation
and a further treatment of the grown oxide in a
low-voltage, high-pressure plasma.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7450 (Superconductor tunnelling phenomena, proximity
effects, and Josephson effect); B3240C (Superconducting
junction devices)",
classification = "704",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "annealing; Ar plasma; arrays; base electrode; cycling;
ellipsometric measurements; high density memory;
interferometers; Josephson effect; junctions; niobium;
RF plasma; storage effects; superconducting devices;
superconducting junction devices; thermal; thin film Nb
Josephson tunnel; tunnel barrier; tunnelling
characteristics",
treatment = "X Experimental",
xxauthor = "R. F. Broom and R. B. Laibowitz and Th. O. Mohr and W.
Walter",
}
@Article{Baker:1980:STB,
author = "John M. Baker and C. J. Kircher and J. W. Matthews",
title = "Structure of Tunnel Barrier Oxide for {Pb}-alloy
{Josephson} Junctions",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "223--234",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The oxide formed on Pb-In and Pb-In-Au alloy films by
processes similar to those used to fabricate oxide
tunnel barriers for experimental Josephson junction
devices has been investigated with transmission
electron microscopy and diffraction (TEM\slash TED),
Auger electron and x-ray photoelectron spectroscopies
(AES and XPS), and ellipsometry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7450 (Superconductor tunnelling phenomena, proximity
effects, and Josephson effect); B3240C (Superconducting
junction devices)",
classification = "704",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Au alloys; Auger effect; Auger electron spectroscopy;
base electrode films; continuous stable epitaxial
layer; cubic; devices; electron microscopy;
ellipsometry; gold alloys; In$_2$O/sub 3/; indium
alloys; Josephson effect; Josephson junctions; lead
alloys; oxidation; Pb-In alloys; Pb-In-; PbO; ray
photoelectron spectra; superconducting devices;
superconducting junction; superconducting junction
devices; surface layer; transmission; transmission
electron microscope examination of materials; tunnel
barrier oxide; X-; X-ray photoelectron spectroscopies",
treatment = "X Experimental",
}
@Article{Kircher:1980:PAR,
author = "C. J. Kircher and S. K. Lahiri",
title = "Properties of {AuIn}$_2$ Resistors for {Josephson}
Integrated Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "235--242",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The influences of film thickness and composition on
the resistivity and microstructure of AuIn$_2$ films,
which are used as resistors in Josephson integrated
circuits, have been investigated. In addition, because
previous work indicated that the resistivity of
AuIn$_2$ films may be due to electron scattering from
grain boundaries or other defects in the films,
representative Au-In alloy films were investigated by
transmission electron microscopy (TEM) to characterize
their microstructures. Results of these experiments
have been used to analyze the factors that govern the
film resistivities.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220E (Thin film circuits); B3240C (Superconducting
junction devices)",
classification = "704",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AuIn$_2$ thin film resistors; electron microscopy
analysis; film resistors; Fuchs surface scattering;
grain size; Josephson effect; Josephson integrated
circuits; reflection coefficients; resistances;
resistivity; Shatzkes grain boundary scattering; sheet;
SiO coated Si wafers Mayadas; superconducting devices;
superconducting junction devices; thin",
treatment = "P Practical",
}
@Article{Tsui:1980:JRS,
author = "Frank F. Tsui",
title = "{JSP} --- a Research Signal Processor in {Josephson}
Technology",
journal = j-IBM-JRD,
volume = "24",
number = "2",
pages = "243--252",
month = mar,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Josephson Signal Processor (JSP) discussed in this
paper is a small, special-purpose computer to be built
with the Josephson tunneling technology using the
Research Signal Processor (RSP) as a precursor. The
main purpose of the JSP is to demonstrate the
feasibility of using Josephson technology to realize an
ultrahigh-speed computer system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260 (Digital signal processing); C5420 (Mainframes
and minicomputers)",
classification = "704; 716; 721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computerised signal processing; current; cycle time;
destructive read out; injection logic technology;
Josephson technology; memory; nondestructive read out;
read only; research signal processor; signal processing
--- Computer Applications; single turn logic
technology; special purpose computers; superconducting
devices; superconducting junction devices; two junction
interferometers",
treatment = "P Practical",
}
@Article{Larsen:1980:SAD,
author = "Richard A. Larsen",
title = "A silicon and aluminum dynamic memory technology",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "268--282",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Silicon and Aluminum Metal Oxide Semiconductor
(SAMOS) technology is presented as a high-yield,
low-cost process to make one-device-cell random access
memories. The characteristics of the process are a
multilayer dielectric gate insulator (oxide-nitride), a
p-type polysilicon field shield, and a doped oxide
diffusion source. Added yield-enhancing features are
backside ion implant gettering, dual dielectric
insulators between metal layers, and circuit
redundancy. A family of chips is produced using SAMOS,
ranging from 18K bits to 64K. System features such as
on-chip data registers are designed on some chips. The
chip technology is merged with ``flip-chip'' packaging
to provide one-inch-square modules from 72K bits
through 512K bits, with typical access times from 90 ns
to 300 ns.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570F (Other MOS integrated
circuits)",
classification = "714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "18K to 64K; backside ion implant gettering; circuit;
data storage, semiconductor; device per cell RAM;
dielectric insulators between metal layers; diffusion
source; doped oxide; dual; dynamic RAM technology;
field effect integrated circuits; flip chip packaging;
IBM; integrated circuit; integrated memory circuits;
integration; large scale; multilayer dielectric gate
insulator; one; p-type poly-Si field shield; RAM;
random-access storage; redundancy; SAMOS; semiconductor
devices, MOS; Si and Al MOS; technology",
treatment = "G General Review; X Experimental",
}
@Article{Gray:1980:CCS,
author = "Kenneth S. Gray",
title = "Cross-Coupled Charge-Transfer Sense Amplifier and
Latch Sense Scheme for High-Density {FET} Memories",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "283--290",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Oct 25 10:36:26 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a sense scheme for use on
high-density one-device cell field effect transistor
random access memories (FET RAMs). The high-sensitivity
threshold-independent cross-coupled charge-transfer
sense amplifier and latch is used. The IBM 64K-bit
one-device dynamic memory cell FET RAM chip design is
used as the vehicle for the discussion. Adaptations
made on the sense amplifier and latch for use with the
sense scheme are discussed. Also described are (1)
dummy cell design, (2) subthreshold leakage
considerations, (3) single-ended input\slash output
(I/O) circuitry sensing and ramifications, (4) multiple
cycle signal degradations, and (5) a maximum supply
voltage ($V_H$) buffer circuit sense scheme
improvement.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570H (Other field effect
integrated circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amplifiers; buffer circuit sense scheme; cross coupled
charge transfer; data storage, semiconductor;
degradations; FET; field effect integrated circuits;
IBM 64K RAM; integrated circuit; integrated memory
circuits; integration; large scale; multiple cycle
signal; one device per cell RAM; RAMs; random-access
storage; semiconductor devices, charge transfer; sense
amplifier; sense amplifier and latch sense scheme;
sense scheme; subthreshold leakage; technology; VLSI",
treatment = "G General Review; X Experimental",
}
@Article{Fitzgerald:1980:CIF,
author = "Brian F. Fitzgerald and Endre P. Thoma",
title = "Circuit Implementation of Fusible Redundant Addresses
on {RAMs} for Productivity Enhancement",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "291--298",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Oct 25 10:38:02 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the circuit schemes used to
substitute redundant storage locations for defective
ones found during testing. Word or bit lines are added
along with appropriate bit steering circuitry to allow
the replacement of a defective word or bit line.
On-chip storage elements are ``set'' by the tester and
used to store the binary addresses of the failing word
or bit lines, which are then compared to the incoming
addresses by the redundancy circuitry. This circuitry
then activates the replacement word or bit lines and,
by various means described, steers out the defective
ones. A variation is described briefly which includes a
word redundant circuit scheme that provides no penalty
in memory access time by using separate sense
amplifiers for the redundant lines.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits)",
classification = "714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bit steering circuitry; circuit; circuit schemes; data
storage, semiconductor; defective storage locations
replacement; fusible redundant addresses;
implementation; integrated circuit technology;
integrated memory circuits; large scale integration;
LSI; productivity enhancement; ram; RAMs; random-access
storage; redundancy; redundant storage",
treatment = "G General Review",
}
@Article{Troutman:1980:VDP,
author = "Ronald R. Troutman",
title = "{VLSI} Device Phenomena in Dynamic Memory and Their
Application to Technology Development and Device
Design",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "299--309",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Several dimensional limitations arise from the
electrical characteristics both of intentionally
switching devices and of possible parasitic devices.
Account must be taken of threshold dependence on both
channel length and width. Furthermore, any isolation
scheme must not introduce leakage from the storage
node, such as parasitic subthreshold and low-level
punch-through currents. Hot electron emission depends
on both horizontal and vertical dimensions and must be
minimized to guarantee the requisite long-term device
behavior. This paper discusses the physical origins of
the above fundamental device phenomena, their influence
on SAMOS device design, and implications for future
memory technologies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570F (Other MOS integrated
circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, semiconductor; dynamic RAM; electrical
characteristics; field effect integrated circuits;
integrated circuit; integrated circuits --- Very Large
Scale Integration; integrated memory circuits;
integration; intentionally switching devices; large
scale; parasitic devices; random-access storage; SAMOS;
technology; VLSI device phenomena",
treatment = "G General Review",
}
@Article{Geipel:1980:RLI,
author = "Henry J. {Geipel, Jr.} and Warren K. Tice",
title = "Reduction of Leakage by Implantation Gettering in
{VLSI} Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "310--317",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Damage introduced by ion implantation on the back side
of the wafer is used to reduce the MOS transient
(relaxation) and junction leakage; the technique is
applied to dynamic memory cells.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2550B (Semiconductor
doping); B2570H (Other field effect integrated
circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access storage; Ar; argon; B; boron; circuit
technology; data storage, semiconductor --- Storage
Devices; dynamic RAM; field effect integrated circuits;
gettering; implantation; integrated; integrated
circuits; integrated memory circuits; ion; ion
implantation; Kr; krypton; large scale integration;
leakage reduction; random-; reducing; relaxation
leakage; VLSI; Xe; xenon",
treatment = "X Experimental",
}
@Article{Lo:1980:FDR,
author = "T. C. Lo and Roy E. Scheuerlein and Robert Tamlyn",
title = "{64K FET} Dynamic Random Access Memory: Design
Considerations and Description",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "318--327",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Oct 25 10:36:40 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The major design considerations and design features of
an experimental 64K-bit random access memory (RAM),
implemented in a double polysilicon gate technology,
are described in this paper. Design tradeoffs
addressing power supply selection and chip
configuration alternatives are presented. This is
followed by a description of the 8K-word by 8-bit FET
dynamic RAM which uses single-transistor cells with
first-level-metal bit lines and second-level-metal
stitched polysilicon word lines. Test results obtained
on early engineering hardware chips fabricated with
linear dimensions 1.2 times those of the base design
are also presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570H (Other field effect
integrated circuits)",
classification = "714; 721",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "64K dynamic RAM; chip configuration alternatives; data
storage, semiconductor; design considerations; design
features; design tradeoffs; double poly-Si gate
technology; field effect integrated circuits;
integrated circuit; integrated memory circuits;
integration; large scale; power supply; ram;
random-access storage; selection; technology",
treatment = "G General Review",
}
@Article{Tzou:1980:CDM,
author = "Albert J. Tzou and Y. R. Gopalakrishna and Eugene M.
Blaser and Ori Bar-Gadda and Rodolfo A. Carballo",
title = "A {256K-bit} charge-coupled device memory",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "328--338",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the design of an experimental
256K-bit serial-access memory using VLSI fabrication
technology and low-power dynamic circuits. The unique
design features and the organization of the 256K CCD
chip are discussed; the array organization, the chip
layout, the peripheral circuitry, and the
buried-channel CCD device design are described; and
test results obtained on experimental hardware are
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570H (Other field effect
integrated circuits)",
classification = "713; 714; 721",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "256K CCD; 300 ns/bit cycle; 310 mW dissipation; 64
blocks of 4K bits; array organisation; charge-coupled
device circuits; chip layout; circuitry; circuits; data
storage, semiconductor --- Storage Devices; double;
experimental hardware; field effect integrated;
integrated circuit technology; integrated circuits ---
Very Large Scale Integration; integrated memory; large
scale integration; memory; peripheral; poly-Si process;
semiconductor devices, charge coupled; serial access
memory; test results; VLSI fabrication technology",
treatment = "G General Review; X Experimental",
}
@Article{Rideout:1980:OMC,
author = "V. Leo Rideout and John J. Walker and Alice Cramer",
title = "One-Device Memory Cell Using a Single Layer of
Polysilicon and a Self-Registering Metal-To-Polysilicon
Contact",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "339--347",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The fabrication and operation of a novel one-device
dynamic memory cell are described. Like the
conventional double overlapping polysilicon cell, the
new memory cell has a diffused bit line and a metal
word line, uses five basic masking operations, and
provides essentially equivalent cell area for the same
lithographic feature size. Unlike the double
polysilicon cell, however, the new cell uses a single
layer of polysilicon to provide a more planar surface
topography, and a self-registered contact cell is the
use of two lithographic masking operations that define
two patterns in a single polysilicon layer, the MOSFET
gate electrode and the MOS capacitor electrode. The
self-registering contact also facilitates a powerful
polysilicon wiring technique that is applicable to the
access circuits located peripherally to the array of
memory cells.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2550G (Lithography); B2570F
(Other MOS integrated circuits)",
classification = "714; 721",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, semiconductor; diffused bit line;
dynamic; fabrication; field effect integrated circuits;
five basic masking; integrated circuit; integrated
memory circuits; integration; large scale; metal word
line; MOS capacitor electrode; MOSFET gate electrode;
one device memory cell; operations; planar surface
topography; poly-Si wiring; RAM; ram; random-access
storage; selfregistered contact cell; single layer
poly-Si; small cell area; technology",
treatment = "N New Development",
xxauthor = "V. L. Rideout and A. Cramer and J. J. Walker",
}
@Article{Kasprzak:1980:NIS,
author = "Lucian A. Kasprzak and Arun K. Gaind",
title = "Near-Ideal {Si-SiO$_2$} Interfaces",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "348--352",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The objective of this paper is to demonstrate that
chemical vapor deposition (CVD) of SiO$_2$ on Si at
1000 degree C can result in a near-ideal oxide and
interface without the use of a high-temperature
annealing step on both (100) and (111) Si substrates.
By comparing values for properties such as $Q_ss$,
$N_fs$, the interface charge density $Q_ic$, etc., for
both unannealed thermal and CVD SiO$_2$ films, the
authors show that this process may be useful in the
fabrication of IGFETs as well as bipolar devices
because of the control of the Si-SiO$_2$ interface on
both (100) and (111) Si.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7320 (Electronic surface states); A7340Q
(Metal-insulator-semiconductor structures); B2530F
(Metal-insulator-semiconductor structures); B2550
(Semiconductor device technology); B2560R (Insulated
gate field effect transistors)",
classification = "714",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2.27\% HCl additive; 20 nm/minute; chemical vapour
deposition; CVD coatings; deposition rates 10 to;
IGFET; insulated gate field effect transistors;
interface electron states; near ideal Si-SiO$_2$
interfaces; semiconductor devices; semiconductor
technology; semiconductor-insulator boundaries; silicon
compounds; SiO$_2$ CVD; transistors, field effect",
treatment = "X Experimental",
}
@Article{Ormond:1980:RSG,
author = "Douglas W. Ormond and J. R. Gardiner",
title = "Reliability of {SiO$_2$} Gate Dielectric with
Semi-Recessed Oxide Isolation",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "353--361",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reports the results of a study to minimize
defects in the gate oxide and in the single crystal
substrate of semirecessed oxide (Semi-ROX) structures.
It is shown that both an increase in oxidation mask
thickness and a decrease in wet field oxidation
temperature markedly reduce the incidence of low
voltage breakdown in the gate oxide. Microscopic
studies of samples which exhibited low voltage
breakdown showed that the Si$_3$N$_4$ oxidation mask
had failed to protect the surface of the region in
which the gate oxide was grown. Semi-ROX processing
also exhibited edge breakdown, most likely due to the
Kooi effect (nitrided Si surface). The use of a thicker
``pad'' oxide and a decrease in the wet field oxide
thickness were beneficial in reducing the magnitude of
degradation in gate breakdown due to this edge
effect.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B1265D (Memory circuits); B2550E
(Surface treatment for semiconductor devices); B2570H
(Other field effect integrated circuits)",
classification = "713; 714; 721",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "charge-coupled device circuits; circuits; data
storage, semiconductor --- Storage Devices; edge
breakdown; field effect integrated; gate breakdown;
integrated circuit manufacture; integrated circuit
technology; integrated circuits --- Very Large Scale
Integration; integrated memory; isolation; Kooi effect;
large scale integration; nitrided Si surface;
oxidation; random-access; reliability; semirecessed
oxide; semiROX structures; SiO$_2$ gate dielectric;
storage",
treatment = "X Experimental",
}
@Article{Rottmann:1980:OL,
author = "Hans R. Rottmann",
title = "Overlay in Lithography",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "361--368 (or 461--468??)",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Advances in lithography rely largely on the capability
of reducing overlay errors, which in turn depends on
the capability to make two-dimensional overlay
measurements. This paper describes a simple and
accurate method of determining singular overlay errors
of step-and-repeat exposure systems with a precision of
plus or minus 0.01 $\mu$ m (standard deviation).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "713; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electron beam lithography; integrated circuit
manufacture; lithography; overlay error; standard
deviation; step and repeat exposure",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Geipel:1980:ISD,
author = "Henry J. {Geipel, Jr.} and Richard B. Shasteen",
title = "Implanted Source\slash Drain Junctions for Polysilicon
Gate Technologies",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "362--369",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Shallow (less than 1.0- $\mu$ m)** plus -p junctions
are required for dense dynamic FET memory. Ion
implantations is a natural technology to fulfill the
geometric requirements of shallow highly doped n** plus
regions in a dual polysilicon gate IGFET technology.
However, implantation of **3**1P and **7**5As at high
dose levels severely damages the crystal lattice and
subsequently is difficult to anneal. This tends to make
implanted junctions more leaky than their diffused
counterparts and causes them to have lower apparent
reverse breakdown voltages. The detrimental effect of
residual end of process damage, resulting from the
implantation, is correlated to the electrical
characteristics of the n** plus -p junction. A junction
process technology is described that can provide
leakage levels of less than 0.25 fA/ mu m**2 (25
nA\slash cm**2), sharp reverse I-V characteristics, and
junction depths of 0.25 to 1.0 $\mu$ m.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550B (Semiconductor doping); B2560R (Insulated gate
field effect transistors); B2570F (Other MOS integrated
circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arsenic; characteristics; data storage, semiconductor
--- Storage Devices; field effect integrated circuits;
field effect transistors; insulated gate; integrated
circuit technology; integrated circuits --- Very Large
Scale Integration; integrated memory circuits;
integration; ion implantation; junction depth 0.25 to 1
micron; junction process technology; large scale;
leakage current <0.25 fA/micron/sup 2/; MOSFET; p-n
homojunctions; phosphorus; sharp reverse IV;
transistors, field effect; VLSI",
treatment = "N New Development; X Experimental",
}
@Article{Verkuil:1980:CMH,
author = "Roger L. Verkuil and Huntington W. Curtis and Mun S.
Pak",
title = "Contactless Method for High-Sensitivity Measurement of
$p$-$n$ Junction Leakage",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "370--377",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Oct 25 10:37:13 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The goals of this paper are to demonstrate
theoretically and empirically that relatively
voltage-independent leakage currents can be rapidly and
conveniently monitored by a noncontacting technique,
and to present the novel instrumentation required to
practice this technique.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2530B (Semiconductor junctions); B2550 (Semiconductor
device technology)",
classification = "714; 721",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2/; contactless p-n junction leakage; coupling; data
storage, semiconductor; diffused p-n junctions; eddy
current loading effect; forward bias conditions; high
sensitivity measurement; inductive; junction decay
times 10/sup -4/ to 1 s; junction leakage currents
10/sup -6/ to 10/sup -10/ A/cm/sup; leakage dependent
decay time; low; low noise VHF oscillator circuitry;
measurement method; p-n homojunctions; p-n junction
leakage; photoinduced voltage; semiconductor
technology",
treatment = "N New Development; X Experimental",
xxauthor = "R. L. Verkuil and M. S. Pak and H. W. Curtis",
}
@Article{Bhattacharyya:1980:CDT,
author = "Arup Bhattacharyya and Donald P. Gaffney and Richard
A. Kenyon and Pierre B. Mollier and James E. Selleck
and Frank W. Wiedman",
title = "{1/N} Circuit and Device Technology",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "378--389",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The 1/N memory cell is the bipolar analog of the FET
one-device cell. A thin dielectric and doped
polysilicon are combined with bipolar technology to
achieve a vertically integrated, high-density,
fast-performance memory chip. The circuit design,
device structure, and processing implementation for a
64K-bit dynamic, 1/N fractional-device, experimental
bipolar memory are presented. Test results for several
geometrical and structural variations, including
16K-bit storage arrays, are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2550 (Semiconductor device
technology); B2570B (Bipolar integrated circuits)",
classification = "714; 721",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1/N memory cell; 16K; access storage; bipolar
integrated circuits; bipolar RAM; circuit; data
storage, semiconductor; design; device structure;
device technology; dynamic RAM; integrated circuit
technology; integrated memory circuits; large scale
integration; one device cell; processing
implementation; random-; storage arrays; VLSI",
treatment = "N New Development; X Experimental",
}
@Article{Bossen:1980:SSM,
author = "Douglas C. Bossen and M. Y. Hsiao",
title = "A system solution to the memory soft error problem",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "390--397",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper, instead of a device or package fix, a
system solution is presented which uses
error-correcting codes in combination with system
maintenance strategy. There is virtually no additional
cost in this solution to the alpha-particle problem and
yet it achieves the desired result. The paper also
describes the basic failure definitions and the memory
cell failure mode caused by alpha-particle and other
radiation sources; and reviews the base
error-correcting-code (ECC) system with respect to a
specific single-error-correcting and
double-error-detecting code example.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570H (Other field effect
integrated circuits); C5380 (Other aspects of storage
devices and techniques); C6150G (Diagnostic, testing,
debugging and evaluating systems)",
classification = "714; 721",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "additional cost; alpha particle RAM chips;
charge-coupled device circuits; correcting code; data
storage, semiconductor; density RAM chips; double error
detecting code; error correction codes;
error-correcting codes; field effect integrated
circuits; high; integrated circuit; integrated memory
circuits; integration; large scale; main memory failure
rate; maintenance strategy; memory soft error problem;
microcode and hardware algorithm; microprogramming;
minimal; overall system approach; random-access
storage; reliability; single error; system; system
solution; technology",
treatment = "N New Development; P Practical",
}
@Article{Stapper:1980:YMP,
author = "C. H. Stapper and Andrew N. McLaren and Martin
Dreckmann",
title = "Yield Model for Productivity Optimization of {VLSI}
Memory Chips with Redundancy and Partially Good
Product",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "398--409",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A model with mixed Poisson statistics has been
developed for calculating the yield for memory chips
with redundant lines and for partially good product.
The mixing process requires two parameters which are
readily obtained from product data. The product is
described in the mode by critical areas which depend on
the circuit's sensitivity to defects, and they can be
determined in a systematic way. The process is
represented in the model by defect densities and gross
yield losses. These are measured with defect monitors
independently of product type. This paper shows how the
yield for any product can be calculated given the
critical areas, defect density, and mixing parameter.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B1265D
(Memory circuits); B2570 (Semiconductor integrated
circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "critical areas; data storage, semiconductor ---
Storage Devices; defect densities; gross yield losses;
integrated circuit; integrated circuit manufacture;
integrated circuits; integrated memory circuits;
integration; large scale; mixed; mixing parameter;
partially good product; Poisson statistics;
productivity optimisation; random-access storage;
redundancy; technology; VLSI memory chips; yield
model",
treatment = "T Theoretical or Mathematical",
}
@Article{Ho:1980:CIT,
author = "Irving T. Ho and Jacob Riseman and Herbert L.
Greenhaus",
title = "A charge injection transistor memory cell",
journal = j-IBM-JRD,
volume = "24",
number = "3",
pages = "410--413",
month = may,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Two versions of an experimental bipolar dynamic memory
cell are described. The memory cell consists of one
p-channel MOSFET and a bipolar npn transistor with
extensive node sharing. The MOSFET device controls the
charge injection into the floating base of the npn
transistor, and the bipolar device provides
amplification for the stored charge during read
operation. For memories, this cell offers performance
associated with bipolar technology and chip density
comparable to MOSFET memories.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits)",
classification = "714; 721",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar dynamic; charge injection transistor memory
cell; CITM; data storage, semiconductor; dynamic RAM;
integrated circuit technology; integrated memory
circuits; large scale integration; memory cell;
MOSFET/npn transistor memory cell; random-access
storage",
treatment = "X Experimental",
}
@Article{Kyser:1980:CSE,
author = "David F. Kyser and Richard Pyle",
title = "Computer Simulation of Electron-Beam Resist Profiles",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "426--437",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A user-oriented, conversational computer program, LMS
(Lithography Modeling System), has been developed for
rapid investigation of the total lithographic process
used in electron-beam lithography, including electron
exposure and resist development. Electron scattering
and energy deposition within the resist film are
simulated with Monte Carlo techniques, including the
significant effects of electrons backscattered from the
substrate. The magnitude of and correction for the
resulting intra-and inter-line proximity effects in the
latent image and their dependence on variables such as
beam voltage, film thickness, substrate material, and
line-pattern geometries are easily investigated with
LMS. The latent image in the resist film is transformed
into a solubility-rate image. The time evolution of the
developed-resist profile and its dependence on electron
dose, solvent, etc. can also be determined.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240G (Monte Carlo methods); B2550G (Lithography);
B2570 (Semiconductor integrated circuits); C7410D
(Electronic engineering computing)",
classification = "711; 713; 714; 723; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "beam voltage; deposition; digital simulation; effect;
electron beam lithography; electron beam resist
profile; electron beams --- Applications; electron
exposure; energy; film thickness; integrated circuit
manufacture; interline proximity effect; intraline
proximity; line pattern geometry; lithography;
lithography modeling system; material; methods; Monte
Carlo; substrate",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Parikh:1980:PEE,
author = "Mihir Parikh",
title = "Proximity Effects in Electron Lithography: Magnitude
and Correction Techniques",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "438--451",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Proximity effects due to electron scattering in the
resist and substrate seem to set a fundamental limit to
the areal density that can be achieved in electron
lithography. This work briefly reviews the form and the
magnitude of the proximity function and its extent as
evidenced by deviations in designed linewidths. It also
discusses methods to decrease the proximity effect as
well as the algorithms used for correction of such
effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "711; 713; 714; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; areal density; electron beam lithography;
electron beams --- Applications; electron lithography;
electron scattering; integrated circuit manufacture;
lithography; magnitude and correction technique;
proximity effect; proximity function; shape
descriptor",
treatment = "A Application; X Experimental",
}
@Article{Hatzakis:1980:SOL,
author = "Michael Hatzakis and Benjamin J. Canavello and Jane M.
Shaw",
title = "Single-Step Optical Lift-Off Process",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "452--460",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A process is described that allows the use of the
lift-off metallization technique with ultraviolet
exposure of a single layer of AZ-type photoresist. The
process consists of soaking the resist layer for a
predetermined time either in chlorobenzene or other
aromatic solvents such as toluene and benzene before or
after exposure. After development, resist profiles with
overhangs suitable for lift-off metallization are
obtained. It appears that removal of solvent and
low-molecular-weight resin from the AZ resist may be
responsible for the observed differential development
rates. In addition, the soak time and temperature
behavior indicate a diffusion-type process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "539; 713; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aromatic solvent; chlorobenzene solvent; integrated
circuit manufacture; lift; lithography; metallizing;
off metallisation; photoresist; resist layer; soak
time; technique; wet etching",
treatment = "A Application; P Practical",
}
@Article{Shatzkes:1980:DBC,
author = "Morris Shatzkes and Moshe Av-Ron and Robert A. Gdula",
title = "Defect-Related Breakdown and Conduction in {SiO$_2$}",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "469--479",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A statistical model incorporating the effects of
defects provides a good representation of breakdown
results for Al-SiO$_2$-Si MOS capacitors. Implications
of this model for interpretation of the yield from life
tests and histograms obtained from ramp tests are
discussed for the case of a Poisson distribution of
defects over the capacitors. The breakdown rates of MOS
capacitors in life tests are found to be correlated to
defects inferred from conduction measurements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2130 (Capacitors); B2560S (Other field effect
devices)",
classification = "712",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "capacitors; defect related breakdown; devices;
histogram; life test; logic testing;
metal-insulator-semiconductor; Poisson distribution;
ramp test; reliability; semiconducting silicon
compounds",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Donath:1980:SWP,
author = "Wilm E. Donath",
title = "Stand-Alone Wiring Program for {Josephson} Logic",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "480--485",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a channel routing wiring program
and its interface to the user. Of particular interest
are its interface facilities, which permit manual
update of the routing, pre-routing, and incremental
routing. A hierarchical organization of the logic is
feasible, which permits moving of complex entities,
such as latches, adders and others, as complete
entities. The internal wiring of these entities could
either be done manually and be fixed before layout,
which would be desirable when the wiring was used as a
delay line, or could be left to the wiring program,
which would route them more flexibly. The features
above are made possible by the special-interface
organization used here. In this interface the pins on
the devices can be directly addressed, relatively
addressed, and indirectly addressed; a simple
macrocompiler permits the hierarchical organization of
the data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210B (Computer-aided logic design)",
classification = "704; 721; 723",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adder; channel routing wiring program; computer
interfaces; data entry program; delay line; latch;
logic CAD; logic design; superconducting devices ---
Josephson Junctions",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Lin:1980:EGD,
author = "Shu Lin and Tadao Kasami and Saburo Yamamura",
title = "Existence of good delta-decodable codes for the
two-user multiple-access adder channel",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "486--495",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper defines a class of delta -decodable codes
for the two-user multiple-access adder channel with
binary inputs. This class is a generalization of the
class of two-user codes investigated by Kasami and Lin
(1978). Lower bounds on the achievable rates of codes
in this class are derived. For a wide range of error
correcting capability, this class contains good
two-user delta -decodable codes with rates lying above
the timesharing line.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
classification = "723",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binary input; codes, symbolic; encoding; multiple
access adder channel; two user code",
treatment = "X Experimental",
}
@Article{Lew:1980:OAL,
author = "John S. Lew",
title = "Optimal Accelerometer Layouts for Data Recovery in
Signature Verification",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "496--511",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Current experimental use of pen acceleration data for
signature verification has prompted the mathematical
theory of a recent paper on the subject, expounding
motion recovery techniques for a special pen with
imbedded accelerometers. This continuation seeks to
optimize the instrument layout as a mechanical filter
which services to extract the kinematic observables
from the experimental noise.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0710 (Mechanical measurement methods and
instruments); C3120E (Velocity, acceleration and
rotation control)",
classification = "943",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accelerometers; layout geometry; signature
verification",
treatment = "A Application; X Experimental",
}
@Article{Adams:1980:PSF,
author = "George G. Adams",
title = "Procedures for the Study of the Flexible-Disk to Head
Interface",
journal = j-IBM-JRD,
volume = "24",
number = "4",
pages = "512--517",
month = jul,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The response of a rotating flexible disk interacting
with a read-write head is analyzed. The disk deflection
due to an arbitrary distributed normal pressure is
coupled with the Reynolds lubrication equation for the
disk-to-head air bearing. Procedures which considerably
reduce the computation time necessary for obtaining a
converged solution are described. A parameter study is
then discussed and its results presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320 (Digital storage)",
classification = "722",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic; disc to head air bearing;
head; head interface; magnetic disc and drum storage;
read write; Reynolds lubrication equation",
treatment = "A Application; X Experimental",
}
@Article{Parikh:1980:PPE,
author = "Mihir Parikh and Donald E. Schreiber",
title = "Pattern Partitioning for Enhanced Proximity-Effect
Corrections in Electron-Beam Lithography",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "530--536",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents new algorithms for judicious
partitioning (or subdivision) of arbitrary lithographic
patterns in order to achieve increased quality of
proximity-effect correction as well as increased
efficiency in the computation of such corrections.
Experimental results verifying the correctness of such
algorithms are also presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B2550 (Semiconductor device technology);
B2550G (Lithography)B2570 (Semiconductor integrated
circuits); C7410D (Electronic engineering computing)",
classification = "745",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computing; correction; electron beam
lithography; electron beams --- Applications;
electronic engineering; electronic engineering
computing; lithography; pattern partitioning; proximity
effect",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Grobman:1980:PCE,
author = "W. D. Grobman and A. J. Speth and T. H. P. Chang",
title = "Proximity Correction Enhancements for $1-\mu m$ Dense
Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "537--544",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In the case of dense circuits with linewidths of about
1 $\mu$ m or smaller, two enhancements to the proximity
correction technique can be easily implemented. One is
a simple approach to shape breakup (partitioning) to
enable dose correction to be applied nonuniformly
within the original design shapes. The other technique
is a new type of algorithm for forming subsets of the
design to perform self-consistent dose correction.
These two enhancements are applied to LSI chip data for
dense circuits and are shown to permit fabrication of
circuits which would be more difficult to process using
the proximity correction techniques described
previously, due to the particular geometries present in
these circuit designs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2570 (Semiconductor integrated circuits);
C7410D (Electronic engineering computing)",
classification = "713; 745",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computing; dose correction; electron beam
lithography; electron beams --- Applications;
electronic engineering; electronic engineering
computing; enhancement; integrated circuit manufacture;
integrated circuit technology; large scale integration;
lithography; LSI; partitioning; pattern recognition;
proximity correction; proximity effect",
treatment = "P Practical",
}
@Article{Davis:1980:RMD,
author = "Donald E. Davis",
title = "Registration Mark Detection for Electron-Beam
Lithography --- {EL1} System",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "545--553",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In electron-beam lithography for the direct exposure
of wafers for integrated circuit manufacturing,
accurate registration is necessary to achieve the
required pattern overlay. This paper examines elements
that should be considered to optimize the registration
mark detection process in an automatic registration
system for an e-beam lithography tool. Included is a
section on the generation of the backscatter signals
and the proper combination of these signals to reduce
the detection uncertainty errors in a system with four
back scatter detectors. Signals obtained from
resist-coated marks with several vertical profiles are
presented for illustration and comparison with the
predicted results. Beam shot noise, resist effects, and
other factors that affect the signal-to-noise ratio are
discussed and some pattern overlay results from EL1 are
given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2570 (Semiconductor integrated circuits);
C7410D (Electronic engineering computing)",
classification = "745",
corpsource = "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic registration system; beam lithography; beam
shot noise; electron; electron beam lithography;
electron beams --- Applications; electronic; electronic
engineering computing; engineering computing; IBM EL1;
integrated circuit technology; lithography; pattern
overlay; registration mark detection; resist effects",
treatment = "P Practical",
}
@Article{Magerlein:1980:ERL,
author = "J. H. Magerlein and D. J. Webb",
title = "Electron-Beam Resists for Lift-Off Processing with
Potential Application to {Josephson} Integrated
Circuits",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "554--562",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Several electron-beam resists suitable for lift-off
processing have been investigated with particular
attention to the requirements for fabricating Pb-alloy
Josephson integrated circuits. The desired resist must
perform well with a baking temperature near 70 degree
C, provide a reproducible undercut edge profile with
good linewidth control, and adhere to the necessary
substrates. Diazo resists as well as the commonly used
PMMA and copolymer materials were studied. Initial
results suggest that AZ-1350J soaked in chlorobenzene
to enhance the undercut profile can satisfy many of
these requirements. At present, the amount of undercut
obtained is larger than desired, limiting the minimum
separation between exposed features to about 1.5 $\mu$
m.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220C (General integrated circuit fabrication
techniques); B3240C (Superconducting junction
devices)",
classification = "713; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "diazo resists; effect; electron beam; electron beams
--- Applications; electron resists; integrated circuit
manufacture; integrated circuit technology; Josephson;
Josephson integrated circuits; junction devices; lead
alloys; lift off processing; linewidth control; Pb
alloy; PMMA; resists; superconducting; superconducting
devices --- Josephson Junctions; superconducting
junction devices; undercut edge profile",
treatment = "A Application; X Experimental",
}
@Article{Bard:1980:ESP,
author = "Yonathan Bard",
title = "Estimation of State Probabilities Using the Maximum
Entropy Principle",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "563--569",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "93E10 (68B20 94A12)",
MRnumber = "81h:93097",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "438.60086",
abstract = "A simple method is derived for computing state
probabilities of a system when the probabilities of
certain aggregate states are known. The method is based
on maximizing the system entropy. It is shown that the
results obtained by the method satisfy certain
assumptions on statistical independence between events.
The method is applied to a problem arising in computer
performance analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310 (EDP management); C5420 (Mainframes and
minicomputers)",
classification = "922",
corpsource = "IBM Cambridge Sci. Center, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer performance analysis; computer selection and
evaluation; entropy; maximum; maximum entropy
principle; principle; probability; state probability
estimation",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Heidelberger:1980:VRT,
author = "Philip Heidelberger",
title = "Variance reduction techniques for the simulation of
{Markov} processes. {I}. {Multiple} estimates",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "570--581",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65C20 (62M05)",
MRnumber = "81k:65014",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "438.60085",
abstract = "A method for reducing the variance of
simulation-generated estimates is proposed and
discussed. The method may be applied to the estimation
of steady state parameters of discrete and continuous
time Markov chains, semi-Markov processes, and
regenerative discrete time Markov processes on a
general state space (such as the waiting time process
in a multiple-server queue). The method is similar to
the technique of control variables, but differs in that
the means of the controls need not be explicitly known.
Numerical results for a variety of simple queueing
models are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); C1140C (Queueing theory);
C1140Z (Other topics in statistics); C1220 (Simulation,
modelling and identification)",
classification = "922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "continuous time; digital; digital simulation; discrete
time Markov chains; estimation of steady state
parameters; Markov chains; Markov processes; multiple
server queue; parameter estimation; probability;
queueing models; queueing theory; regenerative discrete
time Markov processes; semi Markov processes;
simulation; variance reduction technique",
reviewer = "George Marsaglia",
treatment = "T Theoretical or Mathematical",
}
@Article{Markowsky:1980:FWF,
author = "George Markowsky and Michael A. Wesley",
title = "Fleshing out Wire Frames",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "582--597",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68C05 (51-04 51M05 53A17)",
MRnumber = "82f:68035",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Given a polyhedral object, its wire frame is the set
of its edges and vertices. This paper presents
algorithm which discovers all objects with a given wire
frame. This algorithm, which has a number of
applications to mechanical design besides being of
mathematical interest, has been implemented and has
performed well on complex objects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering computing)",
classification = "723; 901",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; computer graphics; engineering --- Design Aids;
mechanical engineering computing; polyhedral; wire
frame",
reviewer = "L. Gyarmathi",
treatment = "P Practical",
}
@Article{Beeteson:1980:DSC,
author = "J. S. Beeteson and Kris T. Jarzebowski and Brian R.
Sowter",
title = "Digital System for Convergence of Three-Beam
High-Resolution Color Data Displays",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "598--611",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a new method of generating and
adjusting convergence waveforms required by a delta-gun
cathode-ray tube for digital color display applications
to ensure that the primary color images produced by
three guns are correctly registered with respect to
each other.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2360 (Electron beam scanned tubes); B7260 (Display
technology and systems); C5540 (Terminals and graphic
displays)",
classification = "714; 741",
corpsource = "IBM UK Labs. Ltd., Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adjustment pattern; cathode ray tube; cathode-ray tube
displays; convergence coil current; convergence
waveforms; correction; crosshair; delta gun; digital
colour data; display; display devices; display
instrumentation; electron tubes, cathode ray; IBM 3279;
microprogram; phase delay; rounding errors;
sensitivity; spot distortion; temperature stability;
three beam high resolution display",
treatment = "P Practical",
}
@Article{Vergnieres:1980:MGA,
author = "Bernard Vergnieres",
title = "Macro Generation Algorithms for {LSI} Custom Chip
Design",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "612--621",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Presented in this paper are macro generation
algorithms which have been developed and implemented
for the optimization of physical and electrical designs
of LSI macro circuits. Any type of logical macro
circuit for a custom chip design can be automatically
generated and optimized through the use of the concepts
and numerical techniques for algorithmic layout
generation and electrical network design which are
described. The application of this design method to
programmable logic array macros, which allow the
generation of very attractive designs, is also
discussed and illustrates the efficiency and
flexibility of the macro generation concept.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B1265F (Microprocessors and
microcomputers); B2570 (Semiconductor integrated
circuits); C5130 (Microprocessor chips); C5210B
(Computer-aided logic design); C7410D (Electronic
engineering computing); C7430 (Computer engineering)",
classification = "713; 721",
corpsource = "IBM Essonnes Component Dev. Lab., Corbeil-Essonnes,
France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; custom chip design; integrated circuit
technology; integrated circuits; large scale
integration; logic CAD; logic design; logical macro
circuit; LSI; macro generation; microprocessor chips;
programmable logic array macros",
treatment = "A Application; P Practical",
}
@Article{Lee:1980:IPM,
author = "Ho Chong Lee and Hi Dong Chai",
title = "Integral Point-Matching Method for Two-Dimensional
{Laplace} Field Problems with Periodic Boundaries",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "622--630",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An integral point-matching technique is applied to
two-dimensional Laplacian fields between periodic
boundaries. This formulation leads to an algorithm that
reduces the size of the matrix, economizing on computer
workspace and inversion time. Several example problems
solved on an APL terminal system are included.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0260 (Numerical approximation and analysis); A4110D
(Electrostatics, magnetostatics); B0290P (Differential
equations); B5100 (Electric and magnetic fields); C4170
(Differential equations); C7410D (Electronic
engineering computing)",
classification = "703",
corpsource = "IBM Systems Products Div. Lab., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL terminal; differential equations; electric fields;
electric networks; electrical; electrical engineering
computing; engineering computing; integral point
matching; Laplace; magnetic fields; numerical methods;
partial; periodic boundaries; technique; transforms;
two dimensional Laplace field",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Petersen:1980:STS,
author = "Kurt E. Petersen",
title = "Silicon Torsional Scanning Mirror",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "631--637",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Conventional batch photolithography and thin film
techniques are employed to fabricate an
electrostatically driven torsional scanning mirror from
single-crystal silicon. This device is extremely simple
to make and operate, has operational characteristics
comparable to commercial magnetically driven
high-frequency scanners, and has exhibited a promising
reliability.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4190 (Other optical system components)",
classification = "741; 745",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "batch photolithography; electrostatically driven
torsional scanning mirror; lithography ---
Applications; mirrors; photolithography; semiconductor
devices; Si; thin film techniques",
treatment = "P Practical",
}
@Article{Franaszek:1980:GMC,
author = "Peter A. Franaszek",
title = "A general method for channel coding",
journal = j-IBM-JRD,
volume = "24",
number = "5",
pages = "638--641",
month = sep,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A procedure is described for constructing minimum
delay codes for discrete noiseless channels. The method
is based on a simple recursive algorithm for finding a
set of coding paths.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; channel coding; codes; codes, symbolic;
discrete noiseless channels; encoding; minimum delay
codes; recursive",
treatment = "T Theoretical or Mathematical",
}
@Article{Scarborough:1980:IOF,
author = "Randolph G. Scarborough and Harwood G. Kolsky",
title = "Improved Optimization of {FORTRAN} Object Programs",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "660--676",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "For many years the FORTRAN H Extended compiler has
produced highly optimized object programs for IBM
System\slash 360 and System\slash 370 computers. A
study of the object programs revealed, however, that
important additional optimizations were possible, and
the compiler has been enhanced accordingly. First, the
range of cases handled by the optimization techniques
already present in the compiler has been extended. For
example, more duplicate computations are eliminated,
and more invariant computations are moved from inner to
outer loops. Second, several new optimizations have
been added, with subscript computation and register
allocation receiving particular attention. Third,
certain optimization restrictions have been removed.
This paper describes these improvements and reports
their effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "723; 922",
corpsource = "IBM Palo Alto Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems --- Program Compilers;
computer programming languages; FORTRAN; FORTRAN H
Extended compiler; FORTRAN object programs; highly; IBM
System/360; optimization; optimized object programs;
program compilers; register allocation; subscript
computation; System/370",
treatment = "P Practical",
}
@Article{Boyle:1980:OCG,
author = "D. Boyle and P. Mundy and T. M. Spence",
title = "Optimization and Code Generation in a Compiler for
Several Machines",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "677--683",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes optimization techniques that have
been implemented in a compiler which was designed to
produce code comparable to that produced by hand.
Additional optimization methods were incorporated into
successive versions of the compiler. It was found that
no single method was effective with all compiled
programs but that each of the techniques described was
effective for some programs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
classification = "723; 922",
corpsource = "IBM Information Services Ltd., Portsmouth, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "code generation; compiler; computer operating systems;
optimization; optimization methods; portability;
program compilers; software; software portability",
treatment = "P Practical",
}
@Article{Marks:1980:CCC,
author = "Brian Marks",
title = "Compilation to Compact Code",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "684--691",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A compilation process is described that emphasizes
small object code rather than fast object code. The
approach entails synthesizing an instruction set and an
interpreter for that instruction set during compilation
of an individual source program. Numerical results are
given for compiling a systems programming subset of
PL/I to System\slash 370 code.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
classification = "722; 723",
corpsource = "IBM United Kingdom Labs., Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compact code; compilation process; computer operating
systems; instruction; interpreter; object code; of
PL/I; program compilers; set; source program;
System/370 code; systems programming subset",
treatment = "P Practical",
}
@Article{Cocke:1980:SRD,
author = "John Cocke and Peter W. Markstein",
title = "Strength Reduction for Division and Modulo with
Application to Accessing a Multilevel Store",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "692--694",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method for replacing certain division and modulo
operations by additions and subtractions is presented.
This optimization allows efficient and easy use of
partitioned arrays to access a multilevel store.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "additions; computer operating systems; computer
systems programming; division; modulo; multilevel
store; optimization; partitioned arrays; storage
allocation; strength reduction; subtractions",
treatment = "P Practical",
}
@Article{Allen:1980:ECS,
author = "F. E. Allen and J. L. Carter and J. Fabri and J.
Ferrante and W. H. Harrison and P. G. Loewner and L. H.
Trevillyan",
title = "The {Experimental Compiling System}",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "695--715",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Experimental Compiling System (ECS) described here
represents a new compiler construction methodology that
uses a compiler base which can be augmented to create a
compiler for any one of a wide class of source
languages. The resulting compiler permits the user to
select code quality ranging from highly optimized to
interpretive. The investigation is concentrating on
easy expression and efficient implementation of
language semantics; syntax analysis is ignored.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "code; computer operating systems; computer programming
languages; Experimental Compiling System; language
semantics; program compilers; quality; source
languages; syntax analysis",
treatment = "P Practical",
}
@Article{Lafuente:1980:STC,
author = "J. M. Lafuente",
title = "Some Techniques for Compile-Time Analysis of
User-Computer Interactions",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "716--731",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Compile-time techniques for analyzing user-computer
interactions and the relationships and dependencies
among items of data that exist during the execution of
interactive application programs are presented. These
techniques are useful in constructing efficient
compilers for languages in which such interactions and
data item relationships and dependencies are described
by nonprocedural statements. The practical value of
using nonprocedural descriptions is that they ease the
task of the application programmer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other processors);
C6150J (Operating systems)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compile-time analysis; computer; computer operating
procedures; computer operating systems; computer
programming languages; data; efficient compilers;
interactive application programs; item relationships;
nonprocedural statements; operating procedures; program
compilers; user-computer interactions",
treatment = "P Practical",
}
@Article{Denil:1980:BL,
author = "N. J. Denil",
title = "A business language",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "732--746",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper describes a language and supporting
interactive system for use by the small businessman. To
help the businessman-user understand and apply an
application program expressed in the language, he can
watch the application run in a single-step mode. If
tailoring of the application program is necessary, the
system guides the user by diagnosing inconsistencies in
the modified program. The user controls production
processing from the same user interface. In the first
part of the paper, the language is described. Next some
example user sessions are outlined. Finally the
prototype implementation and some design issues are
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
classification = "723",
corpsource = "IBM General Systems Div. Lab., Atlanta, GA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "application program; business language;
businessman-user; computer programming languages; high
level; high level languages; interactive system;
languages; production processing",
treatment = "P Practical",
}
@Article{Sauer:1980:LEQ,
author = "Charles H. Sauer and Edward A. MacNair and Silvio
Salza",
title = "A language for extended queueing network models",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "747--755",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Queuing networks are popular as models of performance
of computer systems and communication networks. The
Research Queueing Package, Version 2 (RESQ2), is a
system for constructing and solving extended queuing
network models. The authors refer to the class of RESQ2
networks as ``extended'' because of characteristics
absent from most queuing models. RESQ2 incorporates a
high-level language to concisely describe the structure
of the model and to specify constraints on the
solution. A main feature of the language is the
capability to describe models in a hierarchical
fashion, allowing an analyst to define parametric
submodels which are analogous to macros or procedures
in programming languages. RESQ2 thus encourages use of
structured models to effectively evaluate complex
systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C7430 (Computer
engineering)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2; communication networks; computer networks; computer
programming languages; computer systems; extended
queueing network models; high level languages;
high-level language; parametric submodels; queueing
theory; Research Queueing Package; RESQ2; structured
models; Version",
treatment = "P Practical",
xxtitle = "A Language for Extended Queuing Network Models",
}
@Article{Becerril:1980:GCF,
author = "J. L. Becerril and J. Bondia and R. Casajuana and F.
Valer",
title = "Grammar Characterization of Flowgraphs",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "756--763",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68F05 (68B10)",
MRnumber = "81j:68086",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "444.68069",
abstract = "An extension of the scheme grammar concept given by
Urschler is formalized. It is also show that, in the
usual hierarchy of the theory of formal languages, the
language generated by the scheme grammar is regular
(type 3). The last section gives the description of a
system for the automatic structuring of programs, which
applies these concepts to the Mills algorithm with some
modifications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic)",
classification = "723",
corpsource = "IBM Madrid Sci. Center, Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic; computer programming languages; flowgraphs;
formal languages; grammars; graph theory; Mills
algorithm; scheme grammar; structuring",
treatment = "T Theoretical or Mathematical",
}
@Article{Lomet:1980:DDF,
author = "David B. Lomet",
title = "Data Definition Facility Based on a Value-Oriented
Storage Model",
journal = j-IBM-JRD,
volume = "24",
number = "6",
pages = "764--782",
month = nov,
year = "1980",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A data definition facility is presented that provides
a consistent description of both primitive and user
data. It is based on a value-oriented storage model
which carefully distinguishes between values and
objects. It is values that are typed in this model, and
operations of the type work explicitly on the values.
Objects are accessible only via reference values.
Objects are described via descriptors called templates,
which ultimately yield reference type values.
Operations, both primitive and user-defined, are part
of a ``machine interface,'' and all executable language
constructs can ultimately be defined as explicit
operations of the interface. Importantly, these
operations must respect the typing constraints imposed
by both the primitive types and the user extensions.
The interactions of definition facility, storage model,
and execution model are illustrated via a series of
examples in which commonly used data constructs are
defined.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming languages; data; data definition
facility; data processing; data structures; executable
language constructs; explicit; operations; primitive
types; structures; templates; typing constraints; user;
value-oriented storage model",
treatment = "P Practical",
}
@Article{Huon:1981:NPA,
author = "Simon Huon and Robert Smith",
title = "Network Problem-Determination Aids in
Microprocessor-Based Modems",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "3--16",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper develops the rationale and design
considerations underlying the definition and
implementation of the modem network management
functions that are required for integrating the link
subsystem into a centralized network management system
suitable for user networks conforming to IBM's Systems
Network Architecture.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1250 (Modulators, demodulators, discriminators and
mixers); B6210L (Computer communications); C5600 (Data
communication equipment and techniques); C7410F
(Communications computing)",
classification = "703; 721",
corpsource = "IBM Lab., CER, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3705; ACF/NCP/VS control program; communication
networks; communications computer control; computer
networks; computers, microprocessor; digital signal
processing techniques; electric networks,
communication; IBM data modems; implementation
decisions; LSI; microprocessor-based modems; modems;
network problem determination aids; System/370 NPDA
program product",
treatment = "P Practical",
}
@Article{Godard:1981:MM,
author = "Dominique Godard and Daniel Pilost",
title = "A 2400-bit/s microprocessor-based modem",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "17--24",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the main characteristics of a new
microprocessor-implemented 2400-bit/s data modem, the
IBM 3863. In addition to the execution of signal
processing tasks, the microprocessor provides a variety
of other significant functions such as diagnostics and
aids in network problem determination.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1250 (Modulators, demodulators, discriminators and
mixers); B6210L (Computer communications); C5600 (Data
communication equipment and techniques); C7410F
(Communications computing)",
classification = "703; 721",
corpsource = "IBM Lab., CER, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2400; adaptive equalization; bit/s
microprocessor-based data modem; carrier recovery;
communications computer control; computer networks;
computerised signal processing; computers,
microprocessor; determination; diagnostics; electric
networks, communication; hardware multiplication
capability; IBM 3863; modems; network problem; phase
control; signal processing; timing",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Gruodis:1981:CLT,
author = "A. J. Gruodis and C. S. Chang",
title = "Coupled Lossy Transmission Line Characterization and
Simulation",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "25--41",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It has been shown that the frequency domain solution
of the coupled lossy transmission line differential
equations has a similar appearance to that of the
single line. The frequency-dependent n multiplied by n
characteristic admittance matrix Y$_0$ and propagation
matrix GAMMA can be obtained from network analyzer
insertion loss data treating the coupled transmission
lines as a 2n-port network. This paper develops a
transient simulation technique for coupled lossy
transmission lines based on frequency-dependent Y$_0$
and GAMMA data. Simulation results agree very well with
transient measurements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5240 (Transmission line theory); C7410F
(Communications computing)",
classification = "703",
corpsource = "IBM Data Systems Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "admittance matrix; communication transmission lines;
computer aided analysis; coupled lossy transmission
line; electric networks; frequency domain solution;
frequency-domain analysis; insertion loss data; matrix
algebra; network analyzer; propagation matrix; theory;
transient measurement; transient simulation technique;
transmission line",
treatment = "T Theoretical or Mathematical",
}
@Article{Diaz:1981:PNO,
author = "A. Diaz and J. M. {Vasquez Vallejo} and A. {Martinez
Duran}",
title = "(Pt)polypyrrole: a new organic electrode material",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "42--50",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8245 (Electrochemistry and electrophoresis)",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(Pt/polypyrrole); BF/sub 4/-doped polypyrrole;
electrochemical electrodes; Lewis bases; nucleophiles;
organic electrode material; polymer films; redox
reactions",
treatment = "N New Development; X Experimental",
}
@Article{Street:1981:CPR,
author = "G. B. Street and T. C. Clarke",
title = "Conducting Polymers: a Review of Recent Work",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "51--57",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The conductivities of all the currently reported
conducting polymers are compared to those of the
classical metals. The requirements for a
technologically useful conducting polymer are
considered and the degree to which existing conducting
polymers meet these requirements is evaluated. The
mechanism of doping is discussed together with the
final state of the dopant and the polymer. The
available structural data are described as well as the
problems of structurally characterizing these systems.
Some of the problems of inhomogeneous distribution of
dopant species are also pointed out.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220 (Electrical conductivity phenomena in
semiconductors and insulators)",
classification = "815",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "conducting polymers; doping; inhomogeneous
distribution; polymers; review; reviews; structural
data",
treatment = "G General Review",
}
@Article{Krakow:1981:CSH,
author = "William Krakow",
title = "Computer Simulation of High-Resolution Electron
Micrographs Using Dynamical Electron Scattering",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "58--70",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A system of computer programs has been implemented
that calculates both high-resolution images and
diffraction patterns of generalized objects for the
conventional transmission electron microscope.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650M (Computing devices and techniques); A0780
(Electron and ion microscopes and techniques); C7320
(Physics and chemistry computing)",
classification = "422; 423; 723; 741",
corpsource = "IBM Tomas J. Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(111) Crowdion; amorphous Fe film model; Au crystals;
Bragg; computer programs; computerised instrumentation;
computerised picture; diffraction patterns; diffuse
scattering; digital simulation; dynamical electron
scattering; electron micrographs; high resolution;
images; interstitial; microscopes, electron;
microscopy; processing; reflections; transmission
electron; transmission electron microscope; W",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Pan:1981:TRU,
author = "Kelly M. Pan and C. N. Liu",
title = "Tomographic Reconstruction of Ultrasonic Attenuation
with Correction for Refractive Errors",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "71--82",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The nonionizing and noninvasive characteristics of
ultrasonics promote its increasing use in medical
applications. Computerized ultrasonic attenuation
tomography is one area where medically significant
images may be reconstructed for diagnostic purposes.
The objective of this work is to make an initial
correction for refraction error and other problems
present in computerized ultrasonic tomography.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8760B (Sonic and ultrasonic radiation (medical
uses)); A8770E (Patient diagnostic methods and
instrumentation); C7330 (Biology and medical
computing)",
classification = "461; 753",
corpsource = "Harvard Business School., Boston, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; biomedical engineering; biomedical
ultrasonics; computerised; computerised tomography;
medical applications; noninvasive characteristics;
nonionising characteristics; reconstruction; refraction
error; scanning technique; ultrasonic attenuation
tomography",
treatment = "X Experimental",
}
@Article{Bongiovanni:1981:NRC,
author = "G. Bongiovanni and C. K. Wong",
title = "A number representation convertor for magnetic bubble
string comparators",
journal = j-IBM-JRD,
volume = "25",
number = "1",
pages = "83--87",
month = jan,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120L (Magnetic bubble domain devices); C5230
(Digital arithmetic methods); C5320E (Storage on
stationary magnetic media)",
corpsource = "Univ. di Pisa, Pisa, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1's-complement; 2's-; B1's-complement; comparators;
complement; convertors; digital arithmetic; magnetic
bubble devices; magnetic bubble string; negative
numbers; number representation convertor; sign bit;
signed-magnitude",
treatment = "P Practical",
}
@Article{Logue:1981:TIE,
author = "Joseph C. Logue and Walter J. Kleinfelder and Paul
Lowy and J. Randal Moulic and Wei Wha Wu",
title = "Techniques for Improving Engineering Productivity of
{VLSI} Designs",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "107--115",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The ability of the semiconductor industry to produce
chips with higher and higher circuit densities has
created a challenge for the product designer: to
utilize this capacity and still develop chips rapidly
at reasonable cost. A multi-faceted approach to VLSI
design is described that significantly reduces product
development time and resource from those required with
existing methods. This approach is based on the use of
PLA structures or macros. It consists of a
hardware\slash software modeling technique, use of
laser-personalizable PLAs for rapid modeling of PLA
macros, and a method for repairing design errors (that
may hide other errors) on the actual VLSI wafers with a
laser tool. A two-pass VLSI design is therefore highly
probable.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B1265B (Logic
circuits); B2570 (Semiconductor integrated circuits)",
classification = "713",
corpsource = "IBM System Communications Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "design engineering; errors; hardware/software
modelling technique; improving engineering
productivity; integrated circuits; integrated logic
circuits; integration; large scale; laser
personalizable PLAs; macros; method for repairing
design; multi-faceted approach; PLA; reduces product
development time; structures; VLSI design",
treatment = "A Application; P Practical",
xxauthor = "J. C. Logue and W. J. Kleinfelder and P. Lowy and J.
R. Moulic and Wha Wu Wei",
xxnote = "Check authors??",
}
@Article{Dansky:1981:BCD,
author = "Allan H. Dansky",
title = "Bipolar Circuit Design for a 5000-Circuit {VLSI} Gate
Array",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "116--125",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the design of a bipolar gate
array for a 5000-circuit microprocessor. The physical
design data obtained after completion of automatic
placement and wiring are presented. The distribution of
projected circuit delay for the 4437 nets is then
calculated and this information is used to determine
the selective increase in circuit power to reduce wide
spreads in turn-off and turn-on delays. It is shown
that this technique improves power\slash performance
and has implications for future VLSI designs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180F (Electron and positron effects); A7155F
(Impurity and defect levels in tetrahedrally bonded
nonmetals); A7320H (Surface impurity and defect levels;
energy levels of adsorbed species); A7340Q
(Metal-insulator-semiconductor structures); B2530F
(Metal-insulator-semiconductor structures); B2550
(Semiconductor device technology)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "5000-circuit VLSI gate array; array; bipolar gate;
bipolar IC design; bipolar integrated circuits;
capacitance drive capability; cell; circuit layout CAD;
computers, microprocessor; distribution of; gate-array
chip circuit; integrated circuits; integration; large
scale; layout; logic; logic circuits; logic design;
microprocessor; microprocessor chips; physical design
data; power dissipation; projected circuit delay;
transistor-transistor; TTL",
treatment = "A Application; G General Review",
}
@Article{Dorler:1981:ERA,
author = "Jack Arthur Dorler and Joseph M. Mosley and Glenn A.
Ritter and Richard O. Seeger and James R. Struk",
title = "A 1024-byte {ECL} random access memory using a
complementary transistor switch ({CTS}) cell",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "126--134",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents the design of a 1K-byte random
access memory using a cross-coupled complementary
transistor switch (CTS) cell. The memory operates with
a 4.25-V power supply and achieves a 15-ns access time
with a power dissipation of 1.8 w. This paper also
demonstrates the advantages of using the CTS cell to
achieve high circuit density and good performance of
memory arrays. Array attributes, cell selection
criteria, and cell operation (both ideal and in situ)
as well as design considerations are covered. Hardware
performance is also briefly summarized.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B1265D (Memory circuits);
B2570B (Bipolar integrated circuits); C5320G
(Semiconductor storage)",
classification = "714; 721",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1 K byte RAM; 15-ns access time; 4.25-V power supply;
access storage; array attributes; bipolar integrated
circuits; cell; cell selection criteria; cross coupled
complementary transistor switch; CTS; data storage,
semiconductor; density; design considerations; ECL;
emitter-coupled logic; high circuit; integrated memory
circuits; large scale integration; logic circuits;
memory arrays; operation; performance; power
dissipation 1.8 W; random-; VLSI",
treatment = "G General Review; X Experimental",
}
@Article{Berndlmaier:1981:DRC,
author = "Erich Berndlmaier and Jack Arthur Dorler and Joseph M.
Mosley and Stephen D. Weitzel",
title = "Delay Regulation --- a Circuit Solution to the
Power\slash Performance Tradeoff",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "135--141",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper introduces the concept of delay regulation
as a means of controlling circuit delay variations from
chip to chip, which is especially important in VLSI
products. An embodiment of this concept which applies a
phase-locked loop to individually control chip
performance and power is presented together with
computer-simulated results of an example design. It is
shown that accurate delay equations and the potential
for improved product yield result from application of
the concept. The circuit overhead for large circuits is
shown to be negligible. Application to a wide range of
logic circuit types is also described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B2570 (Semiconductor
integrated circuits); C5120 (Logic and switching
circuits)",
classification = "713; 714",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accurate delay; chip to chip delay; circuit solution;
computer simulated results; concept of; controlling
circuit delay variations; delay regulation; digital
ICs; digital integrated circuits; electronic circuits,
delay type; equations; improved product yield;
individually control chip; integrated circuit
technology; integrated circuits; large scale
integration; performance; phase locked loop;
power/performance tradeoff; variations; VLSI",
treatment = "A Application; N New Development",
}
@Article{Chen:1981:HDB,
author = "Joseph Z. Chen and William Chin and Teh Sen Jen and
Joseph {Hutt, Jr.}",
title = "A high density bipolar logic masterslice for small
systems",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "142--151",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new high-density bipolar logic masterslice which
uses a simple Schottky Transistor Logic (STL) circuit
cell as its basic building block is presented in this
paper. The STL cell is derived from Integrated
Injection Logic (I**2L). The use of low-barrier
Schottky diodes for and logic, as diodes function in
Diode Transistor Logic (DTL), makes possible achieving
the NAND circuit operation. A brief description of the
Schottky diode fabrication process is also given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2560H (Junction and barrier
diodes)B2570B (Bipolar integrated circuits)",
classification = "714; 721",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1.7-V power supply; bipolar integrated circuits;
contact hole personalization; delay 3 ns at 0.5 mW;
diode fabrication process; features; high cell density;
high density bipolar logic masterslice; I/O controller
chip; I/sup 2/L; integrated circuit technology;
integrated injection logic; integrated logic circuits;
large; Logic; logic circuits, diode transistor; low
barrier Schottky diodes; masterslice; propagation;
scale integration; Schottky; Schottky Transistor;
Schottky-barrier diodes; STL; structure; TTL compatible
I/O circuits; unique",
treatment = "N New Development; X Experimental",
}
@Article{Donath:1981:WLD,
author = "Wilm E. Donath",
title = "Wire Length Distribution for Placements of Computer
Logic",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "152--155",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is shown from simple theoretical considerations
that the distribution f$_k$ of wire lengths for a good
two-dimensional placement on a square. Manhattan grid
should be of the form f$_k$ equals g/k** gamma (1 less
than equivalent to k less than equivalent to L) and
f$_k$ approximately equals 0(k greater than L), where
gamma is related to the Rent partitioning exponent p by
the equation 2p plus gamma approximately equals 3.
Three placements were investigated and the distribution
functions for wire length were found to follow the
above relationships.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits)",
classification = "714; 721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "distribution of wire lengths; good two dimensional;
large scale integration; layout design; logic circuits;
placement; square Manhattan grid; theoretical
considerations; VLSI; wiring",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Ling:1981:HSB,
author = "Huey Ling",
title = "High-speed binary adder",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "156--166",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5120 (Logic and switching circuits)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adders; fewer logic levels; high; neighbouring bit;
new carry propagation; new scheme; pairs; reduced
component count; speed binary adder; uniform fanin
loading; uniform fanout loading",
treatment = "N New Development",
}
@Article{Shatzkes:1981:SB,
author = "M. Shatzkes and M. Av-Ron",
title = "Statistics of breakdown",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "167--175",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B2570 (Semiconductor
integrated circuits); C5120 (Logic and switching
circuits)",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "breakdown; devices screening; distributions; electric
breakdown; electronic; life testing; life tests;
metal-insulator-; ordering of defect; production
testing; ramp tests; screening procedures;
semiconductor; semiconductor structures; technology;
thin insulating layers in MOS devices; types",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Paivanas:1981:AFC,
author = "J. A. Paivanas and J. K. Hassan",
title = "Attraction force characteristics engendered by
bounded, radially diverging air flow",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "176--186",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4715C (Laminar boundary layers)",
corpsource = "IBM General Technol. Div. Lab., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air film wafer handling; attraction force;
axisymmetric circular; bound; characteristics; disk
model; equation; experiments; flow Reynolds number;
free disk weight; general energy; inertial forces;
laminar flow; laminar, incompressible flow analysis;
materials handling; momentum balance condition; one
dimensional approach; passage flow friction factor;
radially diverging air flow; resultant reaction fluid
force",
treatment = "A Application; T Theoretical or Mathematical; X
Experimental",
}
@Article{Yhap:1981:OCC,
author = "Ernesto F. Yhap and Evon C. Greanias",
title = "An on-line {Chinese} character recognition system",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "187--195",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an experimental system for the
on-line recognition of handwritten Chinese characters.
Constituent shapes of the characters are recognized as
they are formed on an electronic tablet. The 72
constituent shapes can define a very large set of
Chinese characters. The implementation described
recognizes more than 2200 Chinese characters. More
symbols can be added with relative ease. Experimental
results are given for two writer populations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2200 Chinese; 72 constituent shapes; character
recognition; character recognition equipment;
characters recognition; Chinese character recognition
system; electronic tablet; experimental system;
handwritten Chinese characters; online recognition",
treatment = "X Experimental",
}
@Article{Vinal:1981:MSU,
author = "Albert W. Vinal",
title = "A magnetic sensor utilizing an avalanching
semiconductor device",
journal = j-IBM-JRD,
volume = "25",
number = "2/3",
pages = "196--201",
month = may # "\slash " # jun,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new semiconductor device for sensing uniaxial
magnetic fields has been realized. The device is
basically a dual-collector open-base lateral bipolar
transistor operating in the avalanche region, and is
referred to as a Magnetic Avalanche Transistor. It
exhibits high magnetic transduction sensitivity
compared to traditional Hall-effect and conventional
nonlinear magnetoresistive devices.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630L (Measurement of basic electric and magnetic
variables)A0670D (Sensing and detecting devices);
A0670M (Transducers); A0755 (Magnetic instruments and
techniques); B2560J (Bipolar transistors); B7230
(Sensing devices and transducers); B7310L (Magnetic
variables measurement)",
classification = "714",
corpsource = "IBM System Communication Div. Lab., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2/; avalanche region operation; Avalanche Transistor;
avalanching semiconductor device; bandwidth>5 MHz;
basic structure; bipolar transistors; characteristics;
collector open base lateral bipolar transistor; dual;
fabrication; high magnetic transduction; Magnetic;
magnetic field measurement; magnetic sensor; MAT; new;
ratio 20000/T; S/N; semiconductor device; semiconductor
devices; sensing uniaxial magnetic fields; sensitive
area 5 micron/sup; sensitivity; sensitivity 30V/T;
sensors; transducers",
treatment = "N New Development; X Experimental",
}
@Article{Buturla:1981:FAS,
author = "E. M. Buturla and P. E. Cottrell and B. M. Grossman
and K. A. Salsburg",
title = "Finite-Element Analysis of Semiconductor Devices: the
{FIELDAY} Program",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "218--231",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The FIELDAY program simulates semiconductor devices of
arbitrary shape in one, two, or three dimensions
operating under transient or steady-state conditions. A
wide variety of physical effects, important in bipolar
and field-effect transistors, can be modeled. The
finite-element method transforms the continuum
description of mobile carrier transport in a
semiconductor device to a simulation model at a
discrete number of points. Coupled and decoupled
algorithms offer two methods of linearizing the
differential equations. Direct techniques are used to
solve the resulting matrix equations. Pre-and
post-processors enable users to rapidly generate new
models and analyze results. Specific examples
illustrate the flexibility and accuracy of FIELDAY.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2560B (Semiconductor device modelling and equivalent
circuits); C7410D (Electronic engineering computing)",
classification = "714; 921",
corpsource = "IBM General Technol. Div. Lab., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar; circuit CAD; digital simulation;
field-effect; FIELDAY program; finite element analysis;
finite-element method; mathematical models; mobile
carrier; semiconductor device models; semiconductor
devices; simulation model; steady-state conditions;
transient conditions; transistors; transport",
treatment = "A Application; P Practical",
}
@Article{Hachtel:1981:SAUa,
author = "G. D. Hachtel and M. H. Mack and R. R. O'Brien and B.
Speelpenning",
title = "Semiconductor analysis using finite elements. {I}.
{Computational} aspects",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "232--245",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "SAFE is a general-purpose program for finite-element
analysis of systems of nonlinear, nonvariational PDE.
The form and nonlinearity of the PDE, as well as the
domain, parameters, and boundary conditions of the
problem, are user-specified. A method is given for
unified treatment of nonstandard finite elements such
as bicubic-spline and ``current-continuous''
elements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); C7410D (Electronic engineering computing)",
classification = "714; 921",
corpsource = "IBM Thomas J.Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bicubic-spline; current continuous elements;
equations; finite element analysis; finite-element
analysis; general-purpose program; mathematical models;
partial differential; partial differential equations;
SAFE; semiconductor device models; semiconductor
devices; sparse-matrix methods",
treatment = "A Application; P Practical",
}
@Article{Hachtel:1981:SAUb,
author = "G. D. Hachtel and M. H. Mack and R. R. O'Brien",
title = "Semiconductor analysis using finite elements. {II}.
{IGFET} and {BJT} case studies",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "246--260",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Semiconductor-like Applications of Finite Elements
(SAFE), a novel, nonlinear, general-purpose
two-dimensional finite-element code, is applied to
problems in device modeling. Case studies of
contemporary insulated gate field effect transistor
(IGFET) and bipolar junction transistor (BJT)
structures are given which demonstrate the reliability,
versatility, and efficiency of finite-element methods
in general and of the SAFE program in particular. The
user-defined SAFE physical model is compared with
experiments on a doubly implanted short-channel IGFET.
Computer experiments are performed, indicating how to
select the type, distribution, and
numerical-integration method of finite elements for
maximally efficient, assured-convergence,
engineering-accuracy analysis, either steady state or
transient.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors); B2560R
(Insulated gate field effect transistors); C7410D
(Electronic engineering computing)",
classification = "714; 921",
corpsource = "IBM Thomas J.Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; bipolar junction; bipolar transistors;
digital simulation; engineering-accuracy analysis;
finite element; general-purpose two-dimensional
finite-element code; insulated gate field effect
transistor; insulated gate field effect transistors;
mathematical models; SAFE program; semiconductor device
models; semiconductor devices; steady-state analysis;
transient analysis; transistor",
treatment = "A Application; P Practical; T Theoretical or
Mathematical",
}
@Article{Lee:1981:NVC,
author = "D. T. Lee and S. J. Hong and C. K. Wong",
title = "Number of Vias: a Control Parameter for Global Wiring
of High-Density Chips",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "261--271",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In integrated circuits, components are frequently
interconnected by horizontal and vertical wires in
respective wiring planes whether on chip, card, or
board. The wire changes direction through ``vias'' that
connect the orthogonal wiring planes. Because of
technology constraints, the arrangement of vias must
conform with certain neighborhood restrictions. We
present results on the guaranteed minimum number and
maximum possible number of vias in a given wiring cell
for various technology constraints. These numbers
provide an early means of control on global wiring
routes to further the success of the exact embedding
process that follows global wiring.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2240 (Microassembly techniques); B2570 (Semiconductor
integrated circuits)",
classification = "713",
corpsource = "Northwestern Univ., Evanston, IL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "control parameter; embedding process; global wiring;
high-density chips; integrated circuit technology;
integrated circuits; large scale integration; LSI;
microassembling; vias; wiring planes",
treatment = "A Application; P Practical",
}
@Article{Darringer:1981:LST,
author = "John A. Darringer and William H. {Joyner, Jr.} and C.
Leonard Berman and Louise Trevillyan",
title = "Logic Synthesis Through Local Transformations",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "272--280",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an experimental system for
synthesizing synchronous combinational logic. It allows
a designer to start with a naive implementation
produced automatically from a functional specification,
evaluate it with respect to these many factors, and
incrementally improve this implementation by applying
local transformations until it is acceptable for
manufacture. The use of simple local transformations in
the system ensures correct implementations, isolates
technology-specific data, and will allow the total
process to be applied to larger, VLSI designs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5120 (Logic and switching
circuits); C5210B (Computer-aided logic design); C7410D
(Electronic engineering computing)",
classification = "721",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chip implementations; combinatorial circuits; design;
integrated logic circuits; large; local; logic; logic
CAD; logic design; masterslice chip; scale integration;
synchronous combinational logic; transformations; VLSI
designs",
treatment = "P Practical",
}
@Article{Fitzgerald:1981:GIG,
author = "William Fitzgerald and Franklin Gracer and Robert
Wolfe",
title = "{GRIN}: interactive graphics for modeling solids",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "281--294",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an experimental system for the
original generation and subsequent modification of
volume models of complex physical objects, using
interactive computer graphics. The models are built up
from primitive volumes, e.g., cuboids, cylinders, swept
surfaces, etc., entered by a mechanical engineer
interacting with a two dimensional projection of the
model on a graphic display screen. The primitives may
be entered at any orientation in 3-space and combined
to form a single polyhedral model. The central issue is
the provision of an efficient, natural means for
generating these models.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays); C7440 (Civil
and mechanical engineering computing)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; complex physical objects; computer aided design;
computer graphics; engineering computing; GRIN;
interactive; interactive systems; mechanical;
mechanical engineer; projection; two dimensional;
volume models",
treatment = "A Application; P Practical",
}
@Article{Ju:1981:PMM,
author = "K. Ju and H. L. Hu and R. G. Hirko and E. B. Moore and
D. Y. Saiki and R. O. Schwenker",
title = "Propagation of $1-\mu m$ Bubbles in Contiguous Disk
Devices",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "295--302",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Propagation margins of contiguous disk devices
fabricated on both single-and double-layer garnet films
have been measured. These performance measurements for
1-$\mu$m diameter magnetic bubble propagation were made
on devices with cell sizes of 18 and 30 $\mu$ m**2. The
dependence of bias margin on ion-implantation
conditions, material parameters, propagation pattern
geometries, and temperature is discussed. Deuterium
implantation is introduced, together with a new
propagation pattern.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120L (Magnetic bubble domain devices)",
classification = "721; 722",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bias margin; cell sizes; conditions; contiguous disk
devices; data storage, magnetic; garnet films; garnets;
ion-implantation; magnetic bubble; magnetic bubble
devices; propagation; propagation pattern geometries",
treatment = "P Practical; X Experimental",
}
@Article{Kaufman:1981:PIP,
author = "Frank B. Kaufman",
title = "{Pi-Donor} Intercalate Polymers: Synthesis,
Charge-Transfer Interactions, and Applications",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "303--314",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The purpose of this article is to describe a
relatively new class of organic solids, pi-donor
polymers, which may offer a rather high degree of
desirable synthetic variability. The preparation of
these materials, their unusual electrochemical and
conduction properties in thin-film form, and possible
applications are discussed. In addition, their
properties are compared and contrasted with related
organic and inorganic solid state materials.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7215N (Collective modes; low-dimensional
conductors)",
classification = "815",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "anion; charge-compensating; charge-transfer
interactions; chemical oxidation; electrochemical
treatment; electronic interactions; films;
intercalation compounds; irradiation;
low-ionization-potential; one-dimensional conductivity;
organic donor molecules; pi-donor intercalate polymer;
polymers; synthesis",
treatment = "X Experimental",
}
@Article{Clementi:1981:CSC,
author = "Enrico Clementi",
title = "Computer Simulations of Complex Chemical Systems:
Solvation of {DNA} and Solvent Effects in
Conformational Transitions",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "315--326",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A very detailed representation is now available
concerning the structure and interaction energy of
water molecules in the first solvation shell or in the
``grooves'' of the DNA. The data obtained by computer
simulation are in good agreement with indirect data
from DNA fibers at different relative humidities and
with other indirect evidence. In addition, simulated
results allow for a preliminary model for the solvent
effects in transition processes between different DNA
conformations. The model presented is also in agreement
with available experimental data. Finally, results
report the first determination of the position of
counterions in DNA at different relative humidities and
at room temperature. This application demonstrates the
flexibility of the computational approach.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3620C (Macromolecular conformation (statistics and
dynamics)); A3620H (Macromolecular configuration
(bonds, dimensions)); C7320 (Physics and chemistry
computing)",
classification = "461; 723",
corpsource = "IBM Data Processing Product Group Lab., Poughkeepsie,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "biochemical engineering; complex chemical systems;
computer simulation; conformational transitions;
counterions; digital simulation; DNA; dynamics;
macromolecular; macromolecular configurations;
macromolecular dynamics; physics computing; solvation;
solvent effects",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Kozen:1981:PFL,
author = "Dexter Kozen",
title = "Positive First-Order Logic is {NP-Complete}",
journal = j-IBM-JRD,
volume = "25",
number = "4",
pages = "327--332",
month = jul,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "03D15 (03B25)",
MRnumber = "83b:03050",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The decision problem for positive first-order logic
with equality is NP-complete. More generally, if SIGMA
is a finite set of atomic sentences (i.e., atomic
formulas of the form $t_1$ equals $t_2$ or $Rt_1
\ldots{} t_n$ containing no variables) and negations of
atomic sentences and if PHI is a positive first-order
sentence, then the problem of determining whether phi
is true in all models of SIGMA is NP-complete.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic)",
classification = "922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atomic sentences; decision problem; decision theory
and analysis; formal logic; NP-complete; positive
first-order logic",
reviewer = "Egon B{\"o}rger",
treatment = "T Theoretical or Mathematical",
}
@Article{Kozen:1981:PFO,
author = "Dexter Kozen",
title = "Positive first-order logic is {NP}-complete",
journal = j-IBM-JRD,
volume = "25",
number = "??",
pages = "327--332",
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "481.03026",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bashe:1981:AIE,
author = "C. J. Bashe and W. Buchholz and G. V. Hawkins and J.
J. Ingram and N. Rochester",
title = "The Architecture of {IBM}'s Early Computers",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "363--375",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Most of the early computers made by IBM for commercial
production are briefly described with an emphasis on
architecture and performance. The description covers a
period of fifteen years, starting with the design of an
experimental machine in 1949 and extending to, but not
including, the announcement in 1964 of System\slash
360.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture; computer architecture; computers ---
Reviews; IBM computers; performance; review; reviews;
System/360",
treatment = "G General Review",
}
@Article{Padegs:1981:SB,
author = "A. Padegs",
title = "{System\slash 360} and Beyond",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "377--390",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The evolution of modern large-scale computer
architecture within IBM is described, starting with the
announcement of System\slash 360 in 1964 and covering
the latest extensions to System\slash 370. Emphasis is
placed on key attributes and on the motivation for
providing them, and an assessment is made of the
experience gained in the implementation and use of the
architecture. The main approaches are discussed for
obtaining implementations at widely differing
performance levels, and a number of significant
implementation parameters for all processors are
listed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "722; 723",
corpsource = "Poughkeepsie Lab., IBM Data Processing Products,
Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; IBM computers; large scale
computer architecture; processors; review; reviews;
System/360",
treatment = "G General Review",
}
@Article{Jarema:1981:IDC,
author = "David R. Jarema and Edward W. Sussenguth",
title = "{IBM} Data Communications: a Quarter Century of
Evolution and Progress",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "391--404",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the evolution of technological
development in data communications at IBM. Rather than
attempting to present a complete history, it emphasizes
the changing environment and describes the more
significant innovations that were incorporated in IBM's
line of data communications products. Evolutionary
developments in this area are traced from
point-to-point batch transmission, to on-line batch
communications, to interactive systems, and finally to
networking. Although several aspects are treated, the
primary focus of this account is on systems
architecture, applications, and technology.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5600 (Data communication equipment and techniques)",
classification = "722; 723",
corpsource = "IBM System Communication Div. Lab., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; data communication systems;
data communications; data processing; development;
evolution; IBM data communications; interactive;
networking; on line batch communications; point to
point batch; reviews; systems; systems architecture;
technological; transmission",
treatment = "G General Review",
}
@Article{Olsen:1981:RSF,
author = "P. F. Olsen and R. J. Orrange",
title = "Real-Time Systems for {Federal} Applications: a Review
of Significant Technological Developments",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "405--416",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Federal Systems Division of IBM has been heavily
involved in complex, on-line, real-time systems for
over twenty-five years. In this paper a representative
sample of these programs are reviewed, and an
evaluation of the significant lessons learned from this
wealth of experience is presented. The key issues which
differentiate real-time systems from their more
conventional data processing counterparts are
identified and their implications are discussed. This
leads to some conclusions regarding the kind of
commitment that is necessary in order to succeed in the
area of real-time applications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C7130 (Public
administration)",
classification = "722",
corpsource = "IBM Federal Systems Div. Facility, Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems, digital; data processing;
evaluation; Federal; government data processing; IBM;
on line systems; real-time systems; review; reviews;
Systems Division; technological developments",
treatment = "A Application; G General Review",
}
@Article{James:1981:ERT,
author = "S. E. James",
title = "Evolution of Real-Time Computer Systems for Manned
Spaceflight",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "417--428",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A brief description of manned spaceflight programs,
their accomplishments, and IBM's involvement is
provided as background information. Emphasis is given
to the development of RTCC systems, as well as to the
technological and architectural changes affecting this
development. Also described were experiences gained in
the management of complex, real-time software systems
and the tools and techniques used in the development
process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B7650E (Space ground support centres); C3360L
(Aerospace control); C7420 (Control engineering
computing); C7460 (Aerospace engineering computing)",
classification = "722; 723",
corpsource = "IBM Federal Systems Div. Facility, Houston, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aerospace computer control; aerospace computing;
architectural changes; computer architecture; computer
systems, digital; computers --- Aerospace Applications;
control systems; evolution; ground; ground based
command; NASA's manned spaceflight program; real time
computer systems; real-time systems; RTCC; software
systems; support systems; systems; tools",
treatment = "A Application; P Practical",
}
@Article{Taylor:1981:LGS,
author = "R. L. Taylor",
title = "Low-End General-Purpose Systems",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "429--440",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Since the announcement of the IBM System/3 in 1969,
IBM has been incorporating leading-edge technology in
products referred to as small general-purpose systems.
With the many models of the System/3, System\slash 32,
System\slash 34, and System\slash 38, IBM has
introduced many technological advances addressing the
needs of diverse customers, from the novice, first-time
user to the experienced user in the distributed data
processing account. By identifying the goals,
objectives, design themes, major salient features, and
development constraints, this paper reviews and
highlights the technical evolution of these products in
terms of their systems layout, processor architecture,
machine structure, and programming support.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "722; 723",
corpsource = "IBM Information Systems Div. Lab., Rochester, MN,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computers; design; distributed data; evolution;
general purpose computers; IBM System/3; low end
general purpose computer systems; machine structure;
processing; processor architecture; programming
support; reviews; salient features; System/32;
System/34; System/38; technical",
treatment = "G General Review",
}
@Article{Harrison:1981:ESR,
author = "Thomas J. Harrison and Bruce W. Landeck and Hal K.
{St. Clair}",
title = "Evolution of Small Real-Time {IBM} Computer Systems",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "441--452 (or 441--451??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper, the evolution of IBM small real-time
systems is traced from the late 1950s to the present.
Emphasis is placed on a few features and requirements
which characterize these systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "722; 723",
corpsource = "IBM Information Systems Div. Lab., Atlanta, GA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer systems, digital; data processing
applications; evolution; industrial processes; oil;
paper machines; real-time systems; refinery units;
requirements; review; reviews; small real-time IBM
computer systems; steel plants; time response",
treatment = "A Application; G General Review",
xxauthor = "T. J. Harrison and H. K. {St Clair} and B. W.
Landeck",
}
@Article{Hsiao:1981:RAS,
author = "M. Y. Hsiao and W. C. Carter and J. W. Thomas and W.
R. Stringfellow",
title = "Reliability, Availability, and Serviceability of {IBM}
Computer Systems: a Quarter Century of Progress",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "453--465",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "RAS developments have been driven primarily by
technological advances and by increases in functional
capability and complexity, but RAS considerations have
also played a leading role and have improved
technological and functional capability. The paper
briefly reviews the progress of computer technology. It
points out how IBM has maintained or improved its
systems RAS capabilities in the face of the greatly
increased number of components and system complexity by
improved system recovery and serviceability capability,
as well as by basic improvements in intrinsic component
failure rate. The paper also covers the CPU, tape, and
disk areas and shows how RAS improvements in these
areas have been significant. The main objective is to
provide a comprehensive view of significant
developments in the RAS characteristics of IBM computer
systems over the past twenty-five years.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "availability; computer operating systems; computer
testing; CPU; disk; IBM computer; performance; RAS;
reliability; review; reviews; serviceability; system
complexity; systems; tape",
treatment = "B Bibliography; G General Review",
}
@Article{Carter:1981:STS,
author = "S. P. Carter",
title = "Software technology. Section 2 in {25th Anniversary}
Issue",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "469--470",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:48:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; languages; performance",
review = "ACM CR 39750",
subject = "D Software, GENERAL \\ K.2 Computing Milieux, HISTORY
OF COMPUTING, Software",
}
@Article{Auslander:1981:EMO,
author = "M. A. Auslander and D. C. Larkin and A. L. Scherr",
title = "The evolution of the {MVS} operating system",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "471--482",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The mechanization of computer operations and the
extension of hardware functions are seen as the basic
purposes of an operating system. An operating system
must fulfill those purposes while providing stability
and continuity to its users. Starting with the data
processing environment of twenty-five years ago, this
paper describes the forces that led to the development
of the OS\slash 360 system design and then traces the
evolution which led to today's MVS system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "722; 723",
corpsource = "IBM Corporate Headquarters, Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer operations; data
processing; environment; hardware functions; multiple
virtual storage; operating system; operating systems
(computers); OS/360 system design; reviews; virtual
storage",
treatment = "G General Review",
}
@Article{Creasy:1981:OVT,
author = "R. J. Creasy",
title = "The origin of the {VM\slash 370} time-sharing system",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "483--490",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "VM\slash 370 is an operating system which provides its
multiple users with seemingly separate and independent
IBM System\slash 370 computing systems. These virtual
machines are simulated using IBM System\slash 370
hardware and have its same architecture. In addition,
VM\slash 370 provides a single-user interactive system
for personal computing and a computer network system
for information interchange among interconnected
machines. VM\slash 370 evolved from an experimental
operating system designed and built over fifteen years
ago. This paper reviews the historical environment,
design influences, and goals which shaped the original
system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "722; 723",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture; computer network; computer operating
systems; computer systems, digital; computing systems;
design; historical environment; IBM System/370;
interactive system; machines; operating system;
operating systems (computers); personal computing;
reviews; system; time-sharing systems; virtual; virtual
machines; VM/370 time-sharing system",
treatment = "G General Review",
}
@Article{Belady:1981:IHM,
author = "L. A. Belady and R. P. Parmelee and C. A. Scalzi",
title = "The {IBM} history of memory management technology",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "491--503",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This history of memory management technology in IBM
during the period between the 1950s and the early 70s
is discussed in this paper. The paper concentrates on
the programming and operating system aspects of the
problem, rather than the hardware technology
involved.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "723",
corpsource = "IBM Corporate Headquarters, Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer software; computer systems programming;
digital storage; management; memory management
technology; operating; operating systems (computers);
programming; review; storage; system",
treatment = "G General Review",
}
@Article{McGee:1981:DBT,
author = "W. C. McGee",
title = "Data Base Technology",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "505--519",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The evolution of data base technology over the past
twenty-five years is surveyed, and major IBM
contributions to this technology are identified and
briefly described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6160 (Database management systems (DBMS))",
classification = "723",
corpsource = "IBM Data Processing Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data base systems; data base technology; database
management systems; DBMS; review",
treatment = "B Bibliography; G General Review",
}
@Article{Sammet:1981:HIT,
author = "Jean E. Sammet",
title = "History of {IBM}'s Technical Contributions to High
Level Programming Languages",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "520--534",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Those IBM languages deemed to have made major
contributions are (in alphabetical order) APL, FORTRAN,
GPSS, and PL/I. Smaller contributions (because of
lesser general usage) have been made by Commercial
Translator, CPS, FOR-MAC, QUIKTRAN, and SCRATCHPAD.
Major contributions were made in the area of formal
definition of languages, through the introduction of
BNF (Backus-Naur Form) for defining language syntax and
VDL (Vienna Definition language) for semantics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
classification = "723",
corpsource = "IBM Federal Systems Div. Headquarters, Bethesda, MD,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL; BNF; Commercial; computer programming languages;
CPS; FORMAC; FORTRAN; GPSS; high level; high level
languages; IBM's technical contributions; PL/I;
programming languages; QUIKTRAN; reviews; SCRATCHPAD;
Translator; VDL",
treatment = "B Bibliography; G General Review",
}
@Article{Allen:1981:HLP,
author = "F. E. Allen",
title = "The History of Language Processor Technology in
{IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "535--548",
month = sep,
year = "1981",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.255.0535",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The history of language processor technology in IBM is
described in this paper. Most of the paper is devoted
to compiler technology; interpreters, assemblers, and
macro systems are discussed briefly. The emphasis is on
scientific contributions and technological advances
from a historical perspective. The synergistic
relationship between theory and practice is a
subtheme.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "assemblers; compiler technology; computer operating
systems; computer programming languages; history;
interpreters; language processor technology; macro
systems; program assemblers; program compilers; program
interpreters",
treatment = "B Bibliography; G General Review",
}
@Article{Lucas:1981:FSP,
author = "P. Lucas",
title = "Formal Semantics of Programming Languages: {VDL}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "549--561",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The history of ideas that led to the first
formalization of the syntax and semantics of PL/I is
sketched. The definition method and notation are known
as the Vienna Definition Language (VDL). The paper
examines the relationship between VDL and both
denotational semantics and the axiomatic approach to
programming language definition.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C6140D (High level languages)",
classification = "723",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "axiomatic approach; computer programming languages;
definition; formal languages; high level languages;
history; Language; PL/I; programming language;
semantics; syntax; Vienna Definition",
treatment = "B Bibliography; G General Review",
}
@Article{Bard:1981:ICC,
author = "Yonathan Bard and Charles H. Sauer",
title = "{IBM} Contributions to Computer Performance Modeling",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "562--570",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Performance modeling can be used throughout the life
of a computer system, from initial design, through
implementation, configuration (and reconfiguration) and
even tuning. Performance models are usually solved by
numerical techniques, where possible, and by
simulation, otherwise. This paper summarizes IBM's
contributions to performance modeling and the solution
of performance models.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C7430 (Computer
engineering)",
classification = "722; 723",
corpsource = "IBM Cambridge Sci. Center, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer performance
modeling; computer testing; numerical techniques",
treatment = "B Bibliography; G General Review",
}
@Article{Flatt:1981:CME,
author = "H. P. Flatt",
title = "Computer Modeling in Energy and the Environment",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "571--581 (or 571--580??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper the contributions of IBM scientists to
improve models in the fields of air pollution, solar
energy, plasma physics, coal gasification, and energy
conservation are summarized. These contributions
include not only better numerical and programming
techniques but improved mathematical models based upon
advances in understanding of the physical processes
involved.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7390 (Other natural sciences computing); C7410B
(Power engineering computing)",
classification = "723; 901",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air pollution; coal gasification; computer modelling;
digital simulation; energy; energy resources; energy
resources --- Computer Applications; environment;
environmental impact; mathematical models; physical
processes; plasma physics; power; solar; solar energy",
treatment = "B Bibliography; G General Review",
}
@Article{Pugh:1981:SSM,
author = "E. W. Pugh and R. A. Henle and D. L. Critchlow and L.
A. Russell",
title = "Solid State Memory Development in {IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "585--602",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Processor memory technology evolved from cathode ray
storage tubes in the early 1950s, through ferrite cores
and thin magnetic films in the 1950s and 1960s, to
bipolar and MOSFET semiconductor memories in the late
1960s through the 1970s. This paper describes these
developments and the technical innovations that made
them possible. It also describes continuing exploratory
efforts, including work on magnetic bubbles --- the
newest solid state memory technology.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); C5320 (Digital storage)",
classification = "714; 721; 722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar semiconductor; cathode ray storage tubes; data
storage, magnetic --- Bubbles; data storage,
semiconductor; digital storage; ferrite cores; films;
IBM processors; information processing equipment;
magnetic bubbles; memories; MOSFET semiconductor
memories; reviews; solid state memory development;
technical innovations; thin magnetic",
treatment = "B Bibliography; G General Review",
xxauthor = "E. W. Pugh and D. L. Critchlow and R. A. Henle and L.
A. Russell",
}
@Article{Rymaszewski:1981:SLT,
author = "E. J. Rymaszewski and J. L. Walsh and G. W. Leehan",
title = "Semiconductor Logic Technology in {IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "603--616",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the evolution of semiconductor
logic technology in IBM from its early replacement of
vacuum tubes in the mid-1950s to the beginnings of
VLSI. It highlights the major challenges and
accomplishments in the development of bipolar and
field-effect transistor technologies and their
embodiment in components for a wide spectrum of IBM
products.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits)",
classification = "714; 721",
corpsource = "IBM General Technol. Div. Lab., East Fishkill
Facility, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar transistor technologies; field effect
transistor technologies; integrated circuit; integrated
circuit technology; integrated circuits; integrated
logic circuits; logic devices; review; reviews;
semiconductor devices; semiconductor logic technology;
technology; tubes; vacuum; VLSI",
treatment = "B Bibliography; G General Review",
}
@Article{Seraphim:1981:EPE,
author = "D. P. Seraphim and I. Feinberg",
title = "Electronic Packaging Evolution in {IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "617--630 (or 617--629??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reviews the development of packaging for
semiconductors since the 1950's with the IBM 1400
Series, and culminated in the IBM 4300 Series of
computers and the IBM 3081. The highlights of the
technical approaches which have been developed over the
twenty-five-year period are discussed briefly in this
paper.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging)",
classification = "723",
corpsource = "IBM System Products Div. Lab., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electronics packaging; IBM 3081; IBM 4300 Series;
interconnections; joints; module; multilayers;
packaging; plated through holes; reviews; semiconductor
connections; solder; soldering; System/360",
treatment = "G General Review",
}
@Article{Case:1981:DAI,
author = "P. W. Case and M. Correia and W. Gianopulos and W. R.
Heller and H. Ofek and T. C. Raymond and R. L. Simek
and C. B. Stieglitz",
title = "Design Automation in {IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "631--646",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the significant steps in the
development of Design Automation technology in IBM, and
covers the design tools which support the design of the
electronic portion of such systems. The paper
emphasizes the systems approaches taken and the topics
of design verification, test generation, and physical
design. Descriptions of the technical contributions and
interactions which have led to the unique
characteristics of IBM's Design Automation systems are
included.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
C5420 (Mainframes and minicomputers); C7410D
(Electronic engineering computing)",
classification = "723",
corpsource = "IBM System Communication Div. Lab., Kingston, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit CAD; computer aided design; design automation
technology; design tools; design verification; digital
systems; physical design; test generation",
treatment = "G General Review",
}
@Article{Harding:1981:SMI,
author = "William E. Harding",
title = "Semiconductor Manufacturing in {IBM}, 1957 to the
Present: a Perspective",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "647--658",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The past twenty-five years have witnessed the
transition from germanium-based, individual transistors
in their hermetically sealed enclosures to VLSI silicon
devices interconnected in modular packages containing
more than 50 000 logic circuits or as many as 500 000
bits of random-access memory. During this progression,
manufacturing facilities producing these modern
products have become more complex and technologically
more sophisticated than those of any other industry.
This review traces these fast-moving changes as they
have occurred in IBM, emphasizing the continuous
expansion of manufacturing skills and disciplines and
how these, in turn, have contributed to the development
of today's products and their respective manufacturing
systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560 (Semiconductor devices); B2570 (Semiconductor
integrated circuits)",
classification = "714",
corpsource = "IBM General Technol. Div. Lab., East Fishkill,
Facility, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuits; hermetically sealed enclosures; integrated
circuit technology; large scale integration; logic;
modular packages; RAM; reviews; semiconductor device
manufacture; semiconductor manufacturing; VLSI Si
devices",
treatment = "G General Review",
}
@Article{Stevens:1981:EMS,
author = "L. D. Stevens",
title = "The evolution of magnetic storage",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "663--675",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper gives a general review and historical
perspective of magnetic storage development within IBM
and is an introduction to the subsequent papers on
disk, diskette, and tape technology and on disk
manufacturing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media)",
classification = "721; 722",
corpsource = "IBM General Products Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "column magnetic tape transport; cost; data processing
systems; data storage, magnetic; magnetic; magnetic
disc and drum storage; magnetic drums; magnetic heads;
magnetic storage; magnetic tapes; movable head disk
drive; performance; reliability; review; reviews; tape
storage; vacuum",
treatment = "B Bibliography; G General Review",
}
@Article{Harker:1981:QCD,
author = "J. M. Harker and D. W. Brede and R. E. Pattison and G.
R. Santana and L. G. Taft",
title = "A quarter century of disk file innovation",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "677--690 (or 677--689??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper traces the development of disk file
technology from the first disk drive to the present. A
number of innovative advances are reviewed in the
evolution of mechanical design, materials, and
processes. These advances constitute the technological
base that has permitted almost four orders of magnitude
of improvement in areal density; they are discussed
from four interrelated aspects: the magnetic head and
its air bearing support; the head positioning actuator;
the disk substrate and its magnetic coating; and the
read\slash write signal detection and clocking
electronics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C3260B (Electric
actuators and final control equipment); C5320C (Storage
on moving magnetic media); C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM General Products Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air bearing support; clocking electronics; data
storage, magnetic; density; design; disk drive; disk
file innovation; disk substrate; electric actuators;
electric drives; head; magnetic coating; magnetic disc
and drum; magnetic head; magnetic heads; mechanical;
positioning actuator; read/write signal detection;
reviews; storage",
treatment = "G General Review",
}
@Article{Harris:1981:IDM,
author = "J. P. Harris and W. B. Phillips and J. F. Wells and W.
D. Winger",
title = "Innovations in the Design of Magnetic Tape
Subsystems",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "691--699 (or 691--670??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper explores the selection of magnetic tape as
an input\slash output medium for electronic computers
and reviews the innovations in the development of
magnetic tape and tape handling machines since their
introduction in the early 1950s.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media); C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM General Products Div. Headquarters, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic; design; electronic computers;
input/output medium; magnetic; magnetic tape equipment;
magnetic tape storage; magnetic tape subsystems;
reviews; tape handling machines; tapes",
treatment = "G General Review",
}
@Article{Engh:1981:IDD,
author = "James T. Engh",
title = "The {IBM} diskette and diskette drive",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "701--710",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The diskette and diskette drive have had a major
influence on data processing. They provide a low-cost,
compact, high-performance solution to the need for a
reusable magnetic medium and have largely replaced the
punched card in many applications. Early applications
were simple program-load functions. Today these have
expanded to a wide range of medium exchange,
information storage, and data processing applications.
This paper examines the history of the development of
these products within IBM. The discussion includes some
of the alternatives considered and some of the problems
encountered during these developments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM Information Systems Div. Lab., Rochester, MN,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data processing; data storage, magnetic; development;
diskette drive; electric drives; history; IBM diskette;
information storage; magnetic; magnetic disc and drum
storage; medium; reviews",
treatment = "G General Review",
}
@Article{Mulvany:1981:IDF,
author = "R. B. Mulvany and L. H. Thompson",
title = "Innovations in Disk File Manufacturing",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "711--723",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses the important innovations in disk
file manufacturing at IBM over the past twenty-five
years. Technology advances in the key components of
disk files --- the magnetic read\slash write head, its
air bearing support, and the disk substrate and
magnetic coating --- have permitted almost four orders
of magnitude increase in areal recording density since
the first disk file, the IBM 350, was shipped in 1957.
Manufacturing capability for these basic recording
technology components has been the key to realizing the
cost\slash performance promise of each new technology.
The evolution of this manufacturing capability is
discussed with an emphasis on important innovations in
processes, materials, tools, and testing techniques.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media); C5320 (Digital storage)",
classification = "721; 722",
corpsource = "IBM General Products Div. Headquarters, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air bearing support; areal; data storage, magnetic;
disk file manufacturing; disk substrate; IBM 350;
magnetic; magnetic coating; magnetic disc and drum
storage; magnetic heads; magnetic read/write head;
recording; recording density; reviews; testing
techniques; tools",
treatment = "G General Review",
}
@Article{Beattie:1981:ITI,
author = "H. S. Beattie and R. A. Rahenkamp",
title = "{IBM} Typewriter Innovation",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "729--739",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper briefly highlights several significant
early milestones and then draws particular attention to
typewriter developments within the IBM Corporation.
Since the introduction of the SELECTRIC Typewriter, it
has evolved in several directions that resulted in the
following: a typewriter to produce high-quality
printing for cold-type composing applications; an
input\slash output writer for use in terminals,
computer consoles, and word processing machines; a
typewriter that can correct errors by mechanically
removing them from the page or covering them up; and
electronic typewriters, using microcircuitry, that
provide more memory and computing power than some early
computers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays)",
classification = "745",
corpsource = "IBM Office Products Div. Lab., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer consoles; electric type bar machines;
electronic; high quality printing; IBM typewriter;
input/output writer; reviews; SELECTRIC; typewriter;
typewriters; word processing; word processing machines;
writing machine",
treatment = "G General Review",
}
@Article{May:1981:IWP,
author = "F. T. May",
title = "{IBM} Word Processing Developments",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "741--754 (or 741--753??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the evolution of word processing
product families and systems in IBM, with emphasis on
the key technological advances that have made possible
the great versatility and high performance available
today.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays); C7100
(Business and administration)",
classification = "723",
corpsource = "IBM Information Systems Div. Lab., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data processing; data processing systems; IBM word
processing developments; Magnetic; magnetic; office
environment; processing systems; quality printed
output; reviews; shared logic word; storage;
Tape/SELECTRIC Typewriter; typewriters; word
processing",
treatment = "G General Review",
}
@Article{Nickel:1981:PTI,
author = "T. Y. Nickel and F. J. Kania",
title = "Printer Technology in {IBM}",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "755--765",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Major developments in printer technology have occurred
during the past twenty-five years. Improvements in such
areas as performance, reliability, and product cost are
described in this paper, along with many of the IBM
impact printer products embodying these developments,
beginning with the well-known 1403 Line Printer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "745",
corpsource = "IBM System Products Div. Lab., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1403 Line Printer; IBM impact printer products;
performance; printer technology; printers; printing
machinery; product cost; reliability; reviews",
treatment = "G General Review",
}
@Article{Elzinga:1981:LEP,
author = "C. D. Elzinga and T. M. Hallmark and R. H. {Mattern,
Jr.} and J. M. Woodward",
title = "Laser Electrophotographic Printing Technology",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "767--773",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the development of a non-impact
printing technology-electrophotography with laser
imaging --- and explains its implementation, in both
office product and system output devices. The key
technical advances made during the development of the
two devices are shown.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4360 (Laser applications); B5180D (Electrostatic
devices); B8660 (Power applications in printing
industries); C5550 (Printers, plotters and other
hard-copy output devices)",
classification = "745",
corpsource = "IBM General Products Div. Facility, Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "development; electrophotography; laser beam
applications; laser electrophotographic printing
technology; laser imaging; office product; printers;
printing; system output devices",
treatment = "P Practical",
}
@Article{Keyes:1981:SIP,
author = "R. W. Keyes and M. I. Nathan",
title = "Semiconductors at {IBM}: Physics, Novel Devices, and
Materials Science",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "779--792",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Work on semiconductor physics, devices, and materials
science carried on at IBM in the last twenty-five years
is reviewed. Topics covered include hot electrons,
inversion layers, the injection laser,
electroluminescence, the Gunn effect, MESFETs, solar
cells, superlattices, and amorphous materials and
effects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0130R (Reviews and tutorial papers; resource
letters); A7220 (Electrical conductivity phenomena in
semiconductors and insulators); A7280 (Conductivity of
specific semiconductors and insulators); A7340
(Electrical and electronic properties of interfaces);
A8630J (Photoelectric conversion; solar cells and
arrays); B2520 (Semiconductor theory, materials and
properties); B2560 (Semiconductor devices); B4320J
(Semiconductor lasers); B8420 (Solar cells and
arrays)",
classification = "714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amorphous materials; amorphous semiconductors;
electroluminescence; Gunn effect; hot carriers; hot
electrons; injection laser; inversion layers; materials
science; MESFETs; novel devices; physics; reviews;
Schottky gate field effect; semiconductor;
semiconductor devices; semiconductor junction lasers;
semiconductors; solar cells; superlattices;
transistors",
treatment = "B Bibliography; G General Review",
}
@Article{Bagus:1981:EST,
author = "Paul S. Bagus and Arthur R. Williams",
title = "Electronic Structure Theory",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "793--810 (or 793--809??)",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper briefly discusses the methods of ab initio
quantum chemistry, a field in which IBMers have devoted
major effort and made substantial innovative,
scientific contributions. Partly as a result of these
contributions, it is now possible to use these methods
to address theoretically problems of practical
importance in chemistry. Major contributions toward
understanding the electronic structure of solids,
particularly with regard to metallic bonding, surface
electronic structure, the nature of magnetism, and
semiconductor defects, are discussed as well as
pioneering efforts in the analysis of photoemission and
low-energy electron diffraction data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A3120 (Specific calculations and results for atoms and
molecules); A7125 (Nonlocalized single-particle
electronic states); A7320 (Electronic surface states)",
classification = "482; 531; 801",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "ab initio calculations; ab initio quantum chemistry;
atomic structure; band structure; bonding; bonds
(chemical); computations; crystals; diffraction data;
electrochemistry; electronic structure theory; history;
large scale; low energy electron; magnetism; metallic;
molecular electronic states; photoemission; physical
chemistry; reviews; semiconductor defects; solids;
surface electron states; surface electronic structure",
treatment = "B Bibliography; G General Review",
}
@Article{Muller:1981:PT,
author = "K. A. Muller and E. Pytte",
title = "Phase transitions",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "811--824",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0130R (Reviews and tutorial papers; resource
letters); A6460 (General studies of phase transitions);
A6470K (Solid-solid transitions); A7530K (Magnetic
phase boundaries); A7780B (Ferroelectric transitions
and Curie point)",
corpsource = "IBM Res. Lab., Zurich, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ferroelectric; ferroelectric transitions; magnetic
transitions; magnetism; nonequilibrium phase
transitions; phase transitions; review; reviews;
solid-state phase transformations; structural;
transitions",
treatment = "B Bibliography; G General Review",
}
@Article{Pippenger:1981:ACT,
author = "Nicholas Pippenger",
title = "Algebraic complexity theory",
journal = j-IBM-JRD,
volume = "25",
number = "5",
pages = "825--832",
month = sep,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68C25 (12-04 65F99 68-02)",
MRnumber = "82k:68020",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "473.68029",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory)",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebraic complexity; algebraic computations; bilinear
forms; computational complexity; matrix multiplication;
multiplication; polynomial; reviews; theory",
treatment = "B Bibliography; G General Review",
}
@Article{Schatzoff:1981:DEC,
author = "Martin Schatzoff",
title = "Design of Experiments in Computer Performance
Evaluation",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "848--859",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The purpose of this paper is to review some of the
basic concepts underlying the statistical design and
analysis of experiments and to illustrate them by means
of examples drawn from studies of computer system
performance. The examples include comparisons of
alternate page replacement and free storage management
algorithms, optimization of a scheduler, and validation
of a system simulation model.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310H (Equipment and software evaluation methods);
C5420 (Mainframes and minicomputers)",
classification = "723",
corpsource = "IBM Data Processing Div. Sci. Center, Cambridge, MA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alternate page replacement; analysis; computer;
computer operating systems; computer selection and
evaluation; free; model; performance evaluation;
reviews; scheduler; statistical; statistical analysis;
statistical design; storage management algorithms;
system simulation",
treatment = "G General Review; P Practical",
}
@Article{Heidelberger:1981:ASM,
author = "Philip Heidelberger and Peter D. Welch",
title = "Adaptive Spectral Methods for Simulation Output
Analysis",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "860--876",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An earlier paper developed a method of confidence
interval generation based on the estimation of p(0)
through the least squares fit of a quadratic to the
logarithm of the periodogram. This method was applied
in a run length control procedure to a sequence of
batched means. This paper considers smoothing
techniques which adapt to the changing spectral shape
in an attempt to improve both the small and large
sample behavior of the method. The techniques
considered are polynomial smoothing with the degree
selected sequentially using standard regression
statistics, polynomial smoothing with the degree
selected by cross validation, and smoothing splines
with the amount of smoothing determined by cross
validation. These techniques were empirically evaluated
both for fixed sample sizes and when incorporated into
the sequential run length control procedure.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140Z (Other topics in statistics); C1220
(Simulation, modelling and identification); C7000
(Computer applications)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "batch means; batch sizes; computer simulation;
confidence intervals; covariance stationary; digital
simulation; polynomial; process; run length; simulation
methodology; smoothing; smoothing splines; smoothing
techniques; spectral analysis; spectral density;
storage requirements; time series",
treatment = "T Theoretical or Mathematical",
}
@Article{Voldman:1981:SC,
author = "J. Voldman and Lee W. Hoevel",
title = "The software-cache connection",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "877--893",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an adaptation of standard Fourier
analysis techniques to the study of software-cache
interactions. The cache is viewed as a ``black box''
boolean signal generator, where ``ones'' correspond to
cache misses and ``zeros'' correspond to cache hits.
The spectrum of this time sequence is used to study the
dynamic characteristics of complex systems and
workloads with minimal a priori knowledge of their
internal organization. Line spectra identify tight
loops accessing regular data structures, while the
overall spectral density reveals the general structure
of instruction localities.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C6120 (File
organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; computer software; data
handling; data structures; dynamic characteristics;
instruction; internal organization; localities; regular
data structures; software-cache interactions; spectral
density; standard Fourier analysis; workloads",
treatment = "P Practical",
}
@Article{Sauer:1981:ASQ,
author = "Charles H. Sauer",
title = "Approximate Solution of Queueing Networks with
Simultaneous Resource Possession",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "894--903",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper extends previous methods for approximate
numerical solution of queueing networks with
homogeneous jobs and simultaneous resource possession
to networks with heterogeneous jobs and simultaneous
resource possession.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)B6210L (Computer communications); C1140C
(Queueing theory); C5620 (Computer networks and
techniques)",
classification = "723; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer networks; heterogeneous jobs; possession;
probability --- Queueing Theory; product form solution;
queueing networks; queueing theory; simultaneous
resource",
treatment = "T Theoretical or Mathematical",
}
@Article{Hamacher:1981:CLA,
author = "V. Carl Hamacher and Gerald S. Shedler",
title = "Collision-Free Local Area Bus Network Performance
Analysis",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "904--914",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with port access control for local
area computer communication bus networks. Emphasizing
properties of the algorithms and delay-throughput
performance, paper focuses on two collision-free access
control schemes recently proposed by Eswaran, Hamacher,
and Shedler; it also provides a comparison of these
schemes to other available bus access techniques. The
performance analysis is based on representation of the
bus network as a closed queueing system with
nonpreemptive priority service.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)B6210L (Computer communications); C1140C
(Queueing theory); C5620 (Computer networks and
techniques)",
classification = "723",
corpsource = "Dept. of Electrical Engng. and Computer Sci., Univ. of
Toronto, Toronto, Ont., Canada",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "closed queueing; collision-free access control;
computer networks; local area computer communication
bus; networks; nonpreemptive priority service; port
access control; queueing theory; system",
treatment = "T Theoretical or Mathematical",
}
@Article{Calo:1981:DAT,
author = "S. B. Calo",
title = "Delay Analysis of a Two-Queue, Nonuniform Message
Channel",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "915--929",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25 (68A05 94A99)",
MRnumber = "84f:60122",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "465.68016",
abstract = "A Message Channel is defined as a tandem connection of
single server queues in which the successive service
times experienced by an particular customer are scaled
versions of the same random variable, and thus it
serves as a model for sparsely connected
store-and-forward data communications networks (or
network segments) where messages typically preserve
their lengths as they traverse the system. A particular
instance of such a nonstandard queueing model is
analyzed in this paper. The system consists of two
single server queues in tandem subject to a Poisson
arrival process (at the first queue) and providing
service according to scaled versions of a sequence of
two-level, discrete random variables. A set of
recursive equations that can be used to solve the model
for any given scaling factor at the second queue
(normalized with respect to the first queue service) is
explicitly derived.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)C1140C (Queueing theory); C5600 (Data
communication equipment and techniques)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer networks; computers; data communication
systems; equations; equilibrium mean cumulative
waiting; message switching; networks; Poisson arrival
process; queueing; queueing model; recursive; service
times; store-and-forward data communications; tandem
connection; theory; two-queue, nonuniform message
channel",
treatment = "A Application; T Theoretical or Mathematical",
xxpages = "915--930",
}
@Article{Stroebel:1981:MRT,
author = "Gary Stroebel",
title = "Message Reassembly Times in a Packet Network",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "930--933",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper addresses the problem of computing the
reassembly time of a multipacket message. All packets
from a single message are assumed to flow in sequence
along the same physical path. The analysis includes the
effects of contention between messages in the network
on the delay time at each station along the path and
its impact of message reassembly time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6150 (Communication system theory); C5600 (Data
communication equipment and techniques)",
classification = "723",
corpsource = "System Products Div. Lab., IBM Corp., Rochester, MN,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "communication networks; computer networks; computers
--- Data Communication Systems; contention; data
communication systems; message; multipacket message;
packet network; packet switching; reassembly time;
switching",
treatment = "T Theoretical or Mathematical",
}
@Article{Wesley:1981:FP,
author = "M. A. Wesley and G. Markowsky",
title = "Fleshing out Projections",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "934--954",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "52-04 (51M20 68G10)",
MRnumber = "84i:52002",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper extends the Wire Frame algorithm to
polyhedral objects described by a set of
two-dimensional projections such as might be seen on an
engineering drawing. The projection process may
introduce another level of ambiguity into
reconstruction problems and increases the possibility
of there being many objects with the same set of
projections. The Projections algorithm presented here
can work with very little information, for example,
only two projections, and find all possible objects
matching the data. However, it is seen that the number
of solutions may be very large and that it may be
reasonable to provide more information in the form of
three or more projections, by labeling corresponding
features in divers views, and by providing depth
information. The Projections algorithm is able to make
use of this extra information and can also accept other
forms of advice, such as whether given points are
inside material.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; CAM; computer graphics; cross sections; depth;
engineering drawings; information; pattern recognition;
polyhedral objects; solid; two dimensional projections;
wire frame algorithm",
reviewer = "Robert Connelly",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Meyer:1981:ESP,
author = "Jeanine Meyer",
title = "An emulation system for programmable sensory robots",
journal = j-IBM-JRD,
volume = "25",
number = "6",
pages = "955--962",
month = nov,
year = "1981",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes EMULA, an experimental
interactive system for the emulation of sensory robots.
EMULA was constructed as a bridge between an existing
language for driving actual robots and an existing
geometric modeling system. The modeling system was
extended to handle mechanisms, such as robots, and an
emulation language was introduced to indicate certain
specific physical effects, including sensory feedback,
grasping and releasing of parts, and gravity. EMULA
allows manipulation programs to be tested by users in
interactive terminal sessions or in batch mode.
Monitoring functions are provided to record actions,
store selected views, and check for collisions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C3355 (Control applications in manufacturing
processes); C7440 (Civil and mechanical engineering
computing)",
classification = "721; 731",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "digital simulation; EMULA interactive system;
emulation; geometric modeling; industrial robots;
interactive systems; manipulation programs;
programmable sensory robots; sensory feedback;
systems",
treatment = "A Application; P Practical",
}
@Article{Pittler:1982:SDT,
author = "Marvin S. Pittler and Don Michael Powers and Dorothy
L. Schnabel",
title = "System Development and Technology Aspects of the {IBM
3081} Processor Complex",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "2--11",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents an overview of the advances in
technology and in the design process, as well as
enhancements in the system design that were associated
with the development of the IBM 3081. Application of
LSI technology to the design of the 3081 Processor
Unit, which contains almost 800 000 logic circuits,
required extensions to silicon device packaging,
interconnection, and cooling technologies. A key
achievement in the 3081 is the incorporation of the
thermal conduction module (TCM), which contains as many
as 45 000 logic circuits, provides a cooling capacity
of up to 300 w, and allows the elimination of one
complete level of packaging --- the card level.
Reliability and serviceability objectives required new
approaches to error detection and fault isolation.
Innovations in system packaging and organization, and
extensive design verification by software and hardware
models, led to the realization of the increased
performance characteristics of the system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B0170J
(Product packaging); B0170N (Reliability); B2570
(Semiconductor integrated circuits); C5420 (Mainframes
and minicomputers)",
classification = "721; 722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "300 W cooling; 3081; aspects; capacity; card level
elimination; computer systems, digital; cooling
technologies; design engineering; design verification
by software; error detection; fault isolation; general
purpose computers; IBM 3081 Processor Complex;
integrated circuits --- Large Scale Integration;
integration; interconnection technology; large scale;
LSI packaging; module; packaging; Processor Unit;
reliability; serviceability; system design; system
packaging; technology; thermal conduction",
treatment = "G General Review",
}
@Article{Gustafson:1982:IPU,
author = "R. N. Gustafson and Frank J. Sparacio",
title = "{IBM 3081} Processor Unit: Design Considerations and
Design Process",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "12--21",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design aspects and the characteristics of the 3081
Processor Unit are described and the tradeoffs that
were made due to the implementation of LSI are
presented. A design strategy was chosen that included
tradeoffs covering the area of machine organization,
performance level, implementation costs, testing and
servicing aids, and development schedules. An
innovative verification effort was introduced into the
design process, capitalizing on a hardware flowcharting
discipline and rigorous design rules. On the basis of
this development experience, some thoughts concerning
VLSI implementations are explored.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B0170J
(Product packaging); B2570 (Semiconductor integrated
circuits); C5420 (Mainframes and minicomputers)",
classification = "721; 722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "characteristics; computer systems, digital;
considerations; design; design engineering; design
process; development schedules; general purpose
computers; hardware flowcharting discipline; IBM 3081
Processor Unit; implementation costs; implementation of
LSI; innovative verification effort; integrated
circuits --- Large Scale Integration; integration;
large scale; machine organization; packaging;
performance level; rigorous design rules; servicing
aids; testing aids; tradeoffs; VLSI implementations",
treatment = "G General Review",
}
@Article{Reilly:1982:PCI,
author = "John Reilly and Arthur Sutton and Robert Nasser and
Robert Griscom",
title = "{Processor Controller} for the {IBM 3081}",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "22--29",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the Processor Controller unit of
the 3081 Processor Complex, which handles the functions
of maintenance, monitoring, and control of the system.
It discusses how this unit has dealt with these changes
to keep pace with the demands of advanced technology
and improved system availability. In providing the
necessary test and support functions of reset and
manual control, the Processor Controller exploits the
level-sensitive scan design capability of the 3081 to
obtain read\slash write access to all latches and
arrays. This design approach, coupled with
significantly expanded capabilities for error recovery,
configuration control, and diagnostics, has
significantly affected the structure and capabilities
of the Processor Controller.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); C5220
(Computer architecture)",
classification = "721; 722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081; availability; computer architecture; computer
systems, digital; configuration control; control;
diagnostics; error recovery; large scale integration;
level-sensitive scan design capability; LSI
implementation; maintenance; monitoring; Processor
Complex; Processor Controller unit; read/write access
to all latches and arrays; system",
treatment = "G General Review",
}
@Article{Blodgett:1982:TCM,
author = "Albert J. {Blodgett, Jr.} and Donald R. Barbour",
title = "Thermal Conduction Module: a High-Performance
Multilayer Ceramic Package",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "30--36",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Innovations in package design coupled with major
advances in multilayer ceramic (MLC) technology provide
a high-performance LSI package for the IBM 3081
Processor Unit. The thermal conduction module (TCM)
utilizes a 90 multiplied by 90-mm MLC substrate to
interconnect up to 118 LSI devices. The substrate,
which typically contains 130 m of impedance-controlled
wiring, provides an array of 121 pads for solder
connections to each device and an array of 1800 pins
for interconnection with the next-level package. A
unique thermal design provides a cooling capacity of up
to 300 W. This paper describes the TCM design and
outlines the processes for fabrication of these
modules. The TCM is compared to prior technologies to
illustrate the improvements in packaging density,
reliability, and performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2220J (Hybrid integrated
circuits); B2570 (Semiconductor integrated circuits)",
classification = "721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "118 LSI devices interconnection; 1800 pins
interconnection; 90*90-mm MLC substrate; computer
systems, digital; cooling; density; dissipation 300;
electronics packaging; fabrication; hybrid ICs; hybrid
integrated circuits; IBM 3081 Processor Unit;
impedance-controlled; LSI package; module; multilayer
ceramic package; packaging; performance; reliability;
TCM; thermal conduction; thermal design; W; wiring",
treatment = "N New Development",
}
@Article{Seraphim:1982:NSP,
author = "Donald P. Seraphim",
title = "New Set of Printed-Circuit Technologies for the {IBM}
3081 Processor Unit",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "37--44",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new set of printed-circuit technologies have been
developed which permit construction of printed-circuit
panels with several kilometers of controlled-impedance
interconnections. Communications between internal
layers of signal planes are achieved through small
plated vias (drilled with a laser), while plated
through-holes are used for the logic service terminals
for cable terminations and module terminals. The panels
are the largest currently known in the industry, 600
multiplied by 700 mm, and have the most layers, 20.
This paper describes new LSI package designs which are
achievable with the exceptional versatility that the
new technologies provide. These technologies encompass
vacuum lamination, electroless plating, photosensitive
dielectric, laser drilling automatic twisted-pair wire
bonding, and other new approaches to printed
circuits.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210B (Printed circuit
layout and design); B2210D (Printed circuit
manufacture)",
classification = "703; 713; 721; 722; 723",
corpsource = "IBM General Technol. Div. Lab., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "600*700 mm PCB; automatic twisted-pair wire; bonding;
circuits; computer systems, digital; conduction
modules; controlled-impedance interconnections;
dielectric; electroless plating; electronic equipment
manufacture; IBM 3081 Processor Unit; internal layers
of signal planes; laser drilling; LSI package designs;
multilayer PCB; packaging; panels; photosensitive;
plated through-holes; plated vias; printed; printed
circuits; printed-circuit; small; technologies;
thermal; vacuum lamination",
treatment = "A Application; N New Development",
}
@Article{Chu:1982:CCL,
author = "Richard C. Chu and Un Pah Hwang and Robert E. Simons",
title = "Conduction Cooling for an {LSI} Package: a
One-Dimensional Approach",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "45--54",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses an innovative conduction-cooling
approach using He gas encapsulation which has been
developed in response to the new LSI technology
requirements. Background is provided on the
liquid-encapsulated-module technology which preceded
the new approach, and the basic challenges encountered
in building a thermal bridge from individual chips to
the module and cold plate are described. The underlying
theory of operation is presented using one-dimensional
mathematical and discrete analog models. The effects of
various factors such as geometry, chip tilt, He
concentration, air leakage, and materials are
illustrated using these models.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2220J (Hybrid integrated
circuits); B2570 (Semiconductor integrated circuits)",
classification = "713; 715; 721; 722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "air leakage; chip tilt; computers --- Circuits;
conduction-cooling; cooling; electronics packaging;
geometry; He concentration; He gas encapsulation;
hybrid ICs; hybrid integrated circuits; individual chip
cooling; integrated circuits; integration; junction
temperatures; large scale; multichip LSI packaging;
one-dimensional approach; operation; packaging;
sensitivity analysis; thermal; thermal design",
treatment = "A Application; N New Development",
}
@Article{Oktay:1982:CMH,
author = "Sevgin Oktay and Herbert C. Kammerer",
title = "Conduction-Cooled Module for High-Performance {LSI}
Devices",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "55--66",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the development and
implementation of a novel packaging concept which meets
the stringent and highly interactive demands on
cooling, reliability, and reworkability of LSI
technology. These requirements resulted in an
innovative packaging approach, referred to as the
thermal conduction module (TCM). The TCM uses
individually spring-loaded ``pistons'' that contact
each ship with helium gas, the conducting medium for
removing heat efficiently. A dismountable hermetic seal
makes multiple access possible for device and substrate
rework, while ensuring mechanical and environmental
protection of critical components. A wide range of
thermal, mechanical, and environmental experiments are
described with analytical and computer models.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2220J (Hybrid integrated
circuits); B2570 (Semiconductor integrated circuits)",
classification = "713; 715",
corpsource = "IBM General Technol. Div. Lab., East Fishkill, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "conduction-cooled module; cooling; cooling medium;
dismountable hermetic seal; electronics packaging;
expected chip temperature distributions; He gas; He gas
encapsulation; hybrid integrated circuits; IBM 3081;
individually spring-loaded pistons; integrated
circuits; integration; large scale; modeling; module;
modules; multichip LSI packaging; packaging; packaging
concept; Processor Unit; reliability; reworkability;
TCM; thermal conduction; thermal performance;
three-dimensional computer",
treatment = "A Application; N New Development",
}
@Article{Bossen:1982:MTP,
author = "Douglas C. Bossen and M. Y. Hsiao",
title = "Model for Transient and Permanent Error-Detection and
Fault-Isolation Coverage",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "67--77",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The model developed in this paper allows the system
designer to project the dynamic error-detection and
fault-isolation coverages of the system as a function
of the failure rates of components and the types and
placement of error checkers, which has resulted in
significant improvements to both detection and
isolation in the IBM 3081 Processor Unit. The model has
also resulted in new probabilistic isolation strategies
based on the likelihood of failures. Our experiences
with this model on several IBM products, including the
3081, show good correlation between the model and
practical experiments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B0170N
(Reliability)C5210 (Logic design methods); C5220
(Computer architecture)",
classification = "722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis of; captured information; computer; computer
maintenance; computer systems, digital; design; dynamic
error detection; error checking; error detection; error
detection model; failure analysis; failure rates of
components; fault tolerant computing; fault-isolation
coverage; IBM 3081; likelihood of failures; logic
testing; permanent error-detection; probabilistic
isolation strategies; Processor Unit; transient error
detection",
treatment = "T Theoretical or Mathematical",
}
@Article{Tendolkar:1982:ADM,
author = "Nandakumar N. Tendolkar and Robert L. Swann",
title = "Automated Diagnostic Methodology for the {IBM 3081}
Processor Complex",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "78--88",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The concepts of automated diagnostics that were
developed for and that are implemented in the IBM 3081
Processor Complex are presented in this paper.
Significant features of the 3081 diagnostics
methodology are the capability to isolate intermittent
as well as solid hardware failures, and the automatic
isolation of a failure to the failing field-replaceable
unit (FRU) in a high percentage of the cases. These
features, which permit a considerable reduction in the
time to repair a failure as compared to previous
systems, are achieved by designing a machine which has
a very high level of error-detection capability as well
as special functions to facilitate fault isolation
using Level-Sensitive Scan Design (LSSD), and which
includes a Processor Controller to implement diagnostic
microprograms. Intermittent failures are isolated by
analyzing data captured at the detection of the error,
and the analysis is concurrent with customer operations
if the error is recoverable.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210 (Logic design methods); C5420 (Mainframes and
minicomputers); C6150G (Diagnostic, testing, debugging
and evaluating systems)",
classification = "722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated diagnostics; automatic testing;
automatically; complex; computer systems, digital;
computer testing; error-detection capability; fault
isolation; fault location; field-replaceable unit;
generated validation tests; IBM 3081 processor;
intermittent failures isolation; Level-Sensitive; logic
testing; LSSD; Processor Controller; Scan Design; solid
failures isolation; stuck faults; time to repair
reduction",
treatment = "G General Review",
}
@Article{Monachino:1982:DVS,
author = "Michael Monachino",
title = "Design Verification System for Large-Scale {LSI}
Designs",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "89--99",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper discusses the use of software modeling
techniques to verify LSI hardware designs, methods used
for deciding when modeling should be stopped and
hardware can be built with sufficient assurance to
permit additional verification to continue on the
hardware, methods for testing the hardware as it is
assembled into a very large processor complex, and the
organization of the design verification system to avoid
duplicate creation of test cases for different stages
of the design process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); C5210B
(Computer-aided logic design); C7410D (Electronic
engineering computing)",
classification = "713; 721; 722; 723",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 system; computer systems, digital; design; design
verification system; implementation process; integrated
circuits; large scale integration; large-scale hardware
designs; logic CAD; LSI; software modeling techniques;
very large processor complex",
treatment = "G General Review",
}
@Article{Hitchcock:1982:TAC,
author = "Robert B. {Hitchcock, Sr.} and Gordon L. Smith and
David D. Cheng",
title = "Timing Analysis of Computer Hardware",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "100--105",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Timing Analysis is a design automation program that
assists computer design engineers in locating problem
timing in a clocked, sequential machine. The program is
effective for large machines because, in part, the
running time is proportional to the number of circuits.
This is in contrast to alternative techniques such as
delay simulation, which requires large numbers of test
patterns, and path tracing, which requires tracing of
all paths. The program also generates standard
deviations for the times so that a statistical timing
design can be produced rather than a worst case
approach. This system has successfully detected all but
a few timing problems for the IBM 3081 Processor Unit
(consisting of almost 800 000 circuits) prior to the
hardware debugging of timing. The 3081 is characterized
by a tight statistical timing design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5210B (Computer-aided logic design); C7430 (Computer
engineering)",
classification = "722",
corpsource = "IBM General Technol. Div. Lab., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer hardware; computer systems, digital;
computing design; design automation program; IBM 3081
Processor Unit; integrated circuits --- Large Scale
Integration; locating problem timing; logic CAD;
machine; sequential; standard deviations; statistical;
Timing Analysis; timing design",
treatment = "G General Review",
}
@Article{Smith:1982:BCH,
author = "Gordon L. Smith and Ralph J. Bahnsen and Harry
Halliwell",
title = "{Boolean} Comparison of Hardware and Flowcharts",
journal = j-IBM-JRD,
volume = "26",
number = "1",
pages = "106--116",
month = jan,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Boolean comparison is a design verification technique
in which two logic networks are compared for functional
equivalence using analysis rather than simulation.
Boolean comparison was used on the IBM 3081 project to
establish that hardware flowcharts and the detailed
hardware logic design were functionally equivalent.
Hardware flowcharts are a graphic form of a hardware
description language which describes the logical
behavior of the machine in terms of the inputs,
outputs, and latches. The logical correctness of the
hardware flowcharts was previously established via
cycle simulation. The concepts and techniques of
Boolean comparison as used on the IBM 3081 project are
described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210B (Computer-aided logic
design); C6110 (Systems analysis and programming)",
classification = "721; 722",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Boolean comparison; computer systems, digital; design
verification; flowcharting; hardware; hardware
flowcharts; IBM 3081 project; integrated logic
circuits; integration; large scale; logic CAD; logic
design; technique",
treatment = "A Application; G General Review",
}
@Article{vonGutfeld:1982:LPE,
author = "R. J. {von Gutfeld} and R. E. Acosta and L. T.
Romankiw",
title = "Laser-Enhanced Plating and Etching: Mechanisms and
Applications",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "136--144",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A laser beam impinging on an electrode is used to
enhance local electroplating or etching rates by
several orders of magnitude, and it is possible to
produce very highly localized electroless plating at
high deposition rates, to greatly enhance and localize
the typical metal-exchange (immersion) plating
reactions, to obtain thermo-battery-driven reactions
with simple single-element aqueous solutions, and to
greatly enhance localized chemical etching. The recent
experiments and the observed laser plating and etching
enhancement phenomena are explored. Some examples of
laser-enhanced plating requiring no external power
sources are also described. Applications of these new
techniques, particularly to maskless microcircuit
repair and design changes, are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180B (Ultraviolet, visible and infrared radiation
effects); A6855 (Thin film growth, structure, and
epitaxy); A8115L (Deposition from liquid phases (melts
and solutions)); A8160C (Surface treatment and
degradation of semiconductors); B2550E (Surface
treatment for semiconductor devices); B2550F
(Metallisation and interconnection technology); B4360
(Laser applications); B8620 (Power applications in
manufacturing industries)",
classification = "539; 744",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "applications; circuit personalization; electrodeless
plating; electroplating; etching; etching techniques;
exchange; focused laser beam; hydrodynamic stirring;
increase in temperature; laser beam applications; laser
enhanced etching; laser-enhanced plating; local; local
charge-transfer kinetics; mechanisms; metallisation;
micron-sized; plating; semiconductor technology",
treatment = "N New Development; X Experimental",
}
@Article{Chuang:1982:LCE,
author = "T. J. Chuang",
title = "Laser-Enhanced Chemical Etching of Solid Surfaces",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "145--151 (or 145--150??)",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The laser-enhanced chemical etching of Si, SiO$_2$,
Ta, and Te films with halogen-containing gases excited
by a pulsed CO$_2$ laser and a continuous-wave (cw)
Ar** plus laser has been studied. Detailed measurements
of the etch rates as functions of the laser frequency,
the laser intensity, and the gas pressure have been
performed for some of the gas-solid systems. The
enhanced surface reactions have been classified into
three categories: those activated by the vibrational
excitation of the etchant molecules, those with
radicals generated by photodissociation, and those
induced by laser excitation of solid substrates.
Examples which illustrate the effects of laser
radiation on these surface photochemical processes are
given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6180B (Ultraviolet, visible and infrared radiation
effects); A8160B (Surface treatment and degradation of
metals and alloys); A8160C (Surface treatment and
degradation of semiconductors); B2520C (Elemental
semiconductors); B2550E (Surface treatment for
semiconductor devices); B4360 (Laser applications)",
classification = "531; 744",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "applications; Ar/sup +/; compounds; elemental
semiconductors; enhanced surface reactions; etch rates;
etching; excitation; gas; gas lasers;
halogen-containing gases; laser; laser beam; laser
excitation of solid; laser frequency; laser intensity;
laser-enhanced chemical etching; photodissociation;
pressure; pulsed CO$_2$ laser; resolutions;
semiconductor technology; Si; silicon; SiO$_2$;
spatial; substrates; surface photochemical processes;
Ta; tantalum; Te; tellurium; vibrational",
treatment = "N New Development",
}
@Article{Jain:1982:UHC,
author = "K. Jain and C. G. Willson and B. J. Lin",
title = "Ultrafast High-Resolution Contact Lithography with
Excimer Lasers",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "151--159",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new technique for speckle-free, fine-line high-speed
lithography using high-power pulsed excimer lasers is
described and demonstrated. Use of stimulated Raman
shifting is proposed for obtaining the most desirable
set of spectral lines for any resist. This permits the
optimization of the exposure wavelengths for a given
resist. Excellent quality images are obtained in
1-$\mu$m-thick diazo-type photoresists by means of
contact printing with a XeCl laser at 308 nm and a KrF
laser at 248 nm. These images are comparable to
state-of-the-art contact lithography obtained with
conventional lamps, but the excimer laser technique is
approximately two orders of magnitude faster.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits); B4320C (Gas lasers); B4360 (Laser
applications)",
classification = "745",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1000 line pairs/mm; AZ-2400; compounds; contact;
contact lithography; diazo-type photoresists;
diazonaphthoquinone-Novolak resist; excimer lasers;
exposure wavelength optimisation; fine-line high-speed
lithography; high-power pulsed excimer;
high-resolution; KrF laser; krypton compounds; lasers;
lithography; photolithography; printing; reciprocity
failure; speckle-free; stimulated Raman shifting; UV;
XeCl laser; xenon",
treatment = "N New Development; X Experimental",
}
@Article{Levenson:1982:IPN,
author = "M. D. Levenson and K. Chiang",
title = "Image Projection with Nonlinear Optics",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "160--170",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The nonlinear optical process of conjugate wavefront
generation by degenerate four-wave mixing can project
images in a manner akin to conventional optical
systems. The underlying physics is quite different, and
the difference allows higher resolution over larger
useful fields. This article reviews the basics of
conjugate wavefront generation and its relationship to
holography, and proposes applications in fine-line
lithography. Initial experiments confirm the predicted
advantages but also point out inadequacies in
present-day nonlinear optics technology.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4265F (Optical phase conjugation); B2550G
(Lithography); B2570 (Semiconductor integrated
circuits); B4340 (Nonlinear optics and devices)",
classification = "741",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "advantages; applications in fine-line lithography;
conjugate wavefront; degenerate four-wave mixing;
generation; holography; image processing; image
projection; inadequacies; nonlinear optics; optical
phase conjugation; optical projectors;
photolithography",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Kiang:1982:MSD,
author = "Ying C. Kiang and J. Randal Moulic and Wei-Kan Chu and
Andrew C. Yen",
title = "Modification of Semiconductor Device Characteristics
by Lasers",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "171--176",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper discusses an emerging area of
laser-semiconductor processing: the effect of laser
irradiation on the electrical parameters of
diffused-function devices. Shallow diffusion of 0.2- to
0.5-$\mu$m depths have been achieved. Transistor
current gains have been modified and the results agree
with the theoretical analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550B (Semiconductor doping); B4360 (Laser
applications)",
classification = "713",
corpsource = "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "diffused-junction devices; effect of laser
irradiation; electrical parameters; integrated circuit
manufacture; laser beam annealing; laser-semiconductor
processing; semiconductor; semiconductor devices;
semiconductor doping; shallow diffusions; technology;
transistor current gains modification",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Dewey:1982:AGL,
author = "A. G. Dewey and J. D. Crow",
title = "Application of {GaAlAs} Lasers to High-Resolution
Liquid-Crystal Projection Displays",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "177--185",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Because of the proximity of the injection laser's
wavelength to the visible spectrum used in the display
projection system, and because of divergence of the
beams in the optical delivery system, a reflective LC
cell was designed. Almost total absorption of the
GaAlAs laser beam was achieved. This paper discusses
the thermal and optical properties of the cell and
their effect on the writing characteristics and the
quality of the projected image (contrast and
brightness). An off-axis projection system, which was
designed for use with the refective cell, creates a
high-resolution image on the screen.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2520D (II-VI and III-V semiconductors); B4125 (Fibre
optics)B4150D (Liquid crystal devices); B4320J
(Semiconductor lasers); B4360 (Laser applications);
B7260 (Display technology and systems)",
classification = "741; 744",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "application; brightness; characteristics; contrast;
crystal displays; display devices --- Laser
Applications; fiber optic delivery system; fibre
optics; GaAlAs lasers; gallium arsenide; high-;
high-resolution liquid-crystal projection displays;
III-V semiconductors; lasers, semiconductor; liquid;
multispot; off-axis projection; optical properties;
powered lasers; reflective cell; scanner system;
semiconductor injection lasers; semiconductor junction
lasers; system; writing",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Tam:1982:LE,
author = "Andrew C. Tam and Richard D. Balanson",
title = "Lasers in Electrophotography",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "186--197",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental investigations of the photogeneration and
transport processes utilized in electrophotography are
now possible because of the short pulse duration, high
peak power, high collimation, monochromaticity,
and\slash or coherence of a laser source. Also, the
increasing availability of reliable and inexpensive
lasers has resulted in many new technological uses of
lasers in electrophotographic applications. In addition
to the continued use of HeNe and HeCd lasers, new
products have been configured with GaAs lasers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0768 (Photography, photographic instruments and
techniques); A4260K (Laser beam applications); B2520D
(II-VI and III-V semiconductors); B4320C (Gas lasers);
B4320J (Semiconductor lasers); B4360 (Laser
applications)",
classification = "744; 745",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cadmium; electrophotography; GaAs lasers; gallium
arsenide; gas lasers; He-Cd; He-Ne lasers; helium; ion
lasers; laser sources; lasers; neon; photography;
semiconductor junction lasers",
treatment = "A Application; X Experimental",
}
@Article{Gutierrez:1982:MPH,
author = "A. R. Gutierrez and J. Friedrich and D. Haarer and H.
Wolfrum",
title = "Multiple Photochemical Hole Burning in Organic Glasses
and Polymers: Spectroscopy and Storage Aspects",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "198--208",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A scheme for optical information storage using
photochemical hole burning (PHB) in amorphous systems
is evaluated. Limits imposed by the nature of PHB in
polymers and glasses and its dependence on temperature
are discussed. It is demonstrated that optical
information storage can be multiplexed by a factor of
10**3 using the frequency dimension and PHB.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4230N (Optical storage and retrieval); A4270F (Other
optical materials); B4110 (Optical materials); C5320K
(Optical storage)",
classification = "741; 744; 803; 804; 812",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amorphous systems; data storage, optical; dependence
on temperature; frequency dimension; glass --- Organic
Compounds; multiplexed by factor 10/sup 3/; optical
glass; optical information; optical storage; organic
glasses; photochemical hole burning; polymers;
spectroscopy; storage",
treatment = "N New Development; X Experimental",
}
@Article{Rabolt:1982:IOR,
author = "J. F. Rabolt and R. Santo and N. E. Schlotter and J.
D. Swalen",
title = "Integrated Optics and {Raman} Scattering: Molecular
Orientation in Thin Polymer Films and
{Langmuir-Blodgett} Monolayers",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "209--216",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Studies of submicron films and molecular monolayers
with infrared and Raman spectroscopy have been hampered
by the inability of current spectroscopic techniques to
detect the minute amount of material present in these
thin-film assemblies. A method for overcoming this
problem by using integrated optics has been
successfully demonstrated. In the case of Raman
studies, the material whose spectrum was desired was
made into an asymmetric slab waveguide or a composite
waveguide structure in which both the optical field
intensity of the in-coupled laser source and the
scattering volume of the sample have been significantly
increased.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0765 (Optical spectroscopy and spectrometers)",
classification = "741",
corpsource = "IBM Res. Div. Lab., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "composite waveguide structure; integrated; integrated
optics; Langmuir films; Langmuir-Blodgett;
measurements; molecular; monolayers; optical
waveguides; optics; orientation; polarized Raman;
Raman; Raman scattering; Raman spectroscopy;
spectroscopy; submicron films; thin film optical
waveguides; thin polymer films",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Brauchle:1982:NCM,
author = "Chr. Br{\"a}uchle and Urs P. Wild and D. M. Burland
and G. C. Bjorklund and D. C. Alvarez",
title = "A new class of materials for holography in the
infrared",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "217--227",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new class of holographic materials is described.
These materials undergo four-level two-photon
photochemistry. The holograms recorded in these
materials are self-developing and are not erased during
reading. Furthermore, the recording process may be
gated off and on by using an auxiliary incoherent light
source. As a specific example of such a system,
holograms formed using samples of an alpha -diketone
dissolved in poly(cyanoacrylate) are described. Gated
holograms have been recorded in this material at 752
and 1064 nm.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4230N (Optical storage and retrieval); A4240K
(Holographic interferometry; other holographic
techniques); A4270G (Light-sensitive materials); B0560
(Polymers and plastics (engineering materials
science)); B4110 (Optical materials); B4350
(Holography)",
classification = "745",
corpsource = "Inst. of Phys. Chem., Univ. of Munich, Munich, West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alpha diketone; auxiliary incoherent light source;
four-level two-photon; gated holograms; holographic
materials; holographic storage; holography; infrared;
infrared imaging; IR holography; photochemistry;
poly(cyanoacrylate); polymers; self developing
holograms; wavelength 1064 nm; wavelength 752 nm",
treatment = "N New Development; T Theoretical or Mathematical; X
Experimental",
xxauthor = "C. Brauchle and U. P. Wild and D. M. Burland and G. C.
Bjorklund and D. C. Alvarez",
}
@Article{Dickson:1982:HIS,
author = "LeRoy D. Dickson and Glenn T. Sincerbox and Albert D.
Wolfheimer",
title = "Holography in the {IBM 3687} Supermarket Scanner",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "228--234",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The IBM 3687 Supermarket Scanner is described, with
emphasis on the holographic deflector disk used to
create the scan pattern. The scanner exploits the
functional advantages of holography to create a dense,
multiple-focal-plane scan pattern with small spot size
and large depth of field. The optical design of the
holographic disk is discussed and basic disk
fabrication concepts are introduced.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4240K (Holographic interferometry; other holographic
techniques); B4350 (Holography); C7160 (Manufacturing
and industrial administration)",
classification = "745",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "design; fabrication; holographic deflector disk;
holographic instruments; holography; IBM 3687
Supermarket Scanner; large depth of field;
multiple-focal-plane; optical; point of sale systems;
POS; scan pattern; small spot size",
treatment = "A Application; N New Development",
}
@Article{Hodgson:1982:LAC,
author = "R. T. Hodgson and Andre B. Minn and James D.
Rockrohr",
title = "Laser-Induced Arcing in Cathode Ray Tubes",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "235--241",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Laser-induced arcing in cathode ray tubes has been
used to study the effect of spontaneous internal
high-voltage arcs under normal operating conditions.
Ruby and Nd:YAG laser systems were compared as laser
sources for the breakdown. Various arc-suppression
schemes for CRT systems were evaluated for future
use.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5280M (Arcs and sparks); B2315 (Gas discharges);
B2360 (Electron beam scanned tubes); B4360 (Laser
applications)",
classification = "714; 744",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arc-; arcs (electric); cathode ray tubes; cathode-ray
tubes; conditions; CRT systems; electron tubes, cathode
ray; laser beam applications; laser induced arcing;
laser sources; Nd:YAG laser systems; normal operating;
ruby laser systems; spontaneous internal high-voltage
arcs; suppression schemes",
treatment = "A Application; X Experimental",
}
@Article{Hofmann:1982:PAS,
author = "J. Hofmann and H. Schmutz",
title = "Performance Analysis of Suspend Locks in Operating
Systems",
journal = j-IBM-JRD,
volume = "26",
number = "2",
pages = "242--259",
month = mar,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Performance models of suspend locks in operating
systems are developed and analyzed. Analytical
expressions and algorithms for numerical results have
been obtained for an arbitrary number of processors, an
arbitrary number of tasks, and one suspend lock. The
results are discussed and important dependencies among
the major characteristic quantities such as queue
length, processor speed, number of processors,
dispatching overhead, and processor degradation are
shown. Expressions are derived permitting the control
program designer to estimate the system impact of
locking during the early design phase.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "721; 722; 723",
corpsource = "Fachhochschule, Heilbronn, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arbitrary; arbitrary number of processors; computer
operating systems; dependencies between
characteristics; dispatching overhead; logic devices;
number of; number of tasks; operating systems;
processor degradation; processor speed; processors;
queue length; supervisory and executive programs;
suspend locks in; system impact",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Bendz:1982:CPS,
author = "D. J. Bendz and R. W. Gedney and J. Rasile",
title = "Cost\slash Performance Single-Chip Module",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "278--285",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The introduction of the high performance T**2L device
technology for the IBM 4300 Systems and the
System\slash 38 required extensions of the 24-mm
metallized ceramic module used in prior IBM systems.
The extension of the metallized ceramic technology into
a physically larger 28-mm module, electrically enhanced
with a reference plane and with fine line (0.025-mm)
wiring, is described. The reliability of this module
was evaluated with particular emphasis on corrosion and
metal migration in humid environments and on exposure
to atmospheric contaminants.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B0170N (Reliability);
B1265B (Logic circuits); B2570B (Bipolar integrated
circuits); C5120 (Logic and switching circuits)",
classification = "714; 721; 722",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atmospheric contaminants; bipolar chip; bipolar
integrated circuits; circuit reliability; computers ---
Circuits; corrosion; encapsulation; environmental
testing; humid environments; IBM 4300; integrated
circuit; integrated logic circuits; logic devices;
metal; metallized ceramic module; migration; module;
modules; packaging; reliability; single-chip;
System/38; T/sup 2/L device technology; testing;
transistor-transistor logic; TTL",
treatment = "A Application; P Practical",
}
@Article{Ho:1982:TMH,
author = "C. W. Ho and D. A. Chance and C. H. Bajorek and R. E.
Acosta",
title = "Thin-Film Module as a High-Performance Semiconductor
Package",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "286--296",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses a multichip module for future
VLSI computer packages on which an array of silicon
chips is directly attached and interconnected by
high-density thin-film lossy transmission lines. Since
the high-performance VLSI chips contain a large number
of off-chip driver circuits which are allowed to switch
simultaneously in operation, low-inductance on-module
capacitors are found to be essential for stabilizing
the on-module power supply. Novel on-module capacitor
structures are therefore proposed, discussed, and
evaluated. Material systems and processing techniques
for both the thin-film interconnection lines and the
capacitor structures are also briefly discussed in the
paper. Development of novel defect detection and repair
techniques has been identified as essential for
fabricating the Thin-Film Module with practical
yields.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2220E (Thin film
circuits); B2220J (Hybrid integrated circuits); B2240
(Microassembly techniques); B2570 (Semiconductor
integrated circuits)",
classification = "713; 714; 721; 722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "capacitors; computers --- Circuits; high-density
thin-film lossy; high-performance semiconductor
package; hybrid integrated circuits; integrated
circuits; integration; large scale; low-inductance
on-module capacitors; module power supply; modules;
multichip module; multilayer ceramic technology; on-;
packaging; semiconductor device manufacture; Si chips;
thin film circuits; thin-film module; transmission
lines; VLSI computer packages",
treatment = "A Application; N New Development; P Practical",
}
@Article{Bonner:1982:APB,
author = "Roy F. Bonner and John A. Asselta and Frank W.
Haining",
title = "Advanced Printed-Circuit Board Design for
High-Performance Computer Applications",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "297--305",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new integrated circuit packaging structure was
needed to support the new 90-mm multilayer ceramic
modules, known as Thermal Conduction Modules (TCMs),
used in the IBM 3081 computers. The structure developed
eliminates one level of packaging (the card level) and
allows up to nine TCMs to be plugged directly into a
large multilayer printed-circuit board using a new
zero-insertion-force connector system. The board has 18
internal circuit planes for signal and power
distribution and accommodates new signal cabling, power
bus, terminating resistors, decoupling capacitors, and
cooling hardware, forming a packaged unit of up to a
quarter million logic gates and half a million bits of
memory. This paper focuses on the detailed design of
the printed-circuit board and on its signal and power
transmission characteristics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210B (Printed circuit
layout and design)",
classification = "703; 713; 722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 computers; 90-mm; applications; capacitors;
characteristics; circuit board design; cooling
hardware; decoupling; high-performance computer; IBM;
integrated circuit packaging structure; integrated
circuits; modules; multilayer ceramic modules;
multilayer PCB; packaging; power bus; power
transmission; printed circuits; printed-; signal
cabling; signal transmission characteristics;
terminating resistors; thermal conduction modules;
zero-insertion-force connector system",
treatment = "A Application; N New Development; P Practical",
}
@Article{Bupp:1982:HBF,
author = "J. R. Bupp and L. N. Chellis and R. E. Ruane and J. P.
Wiley",
title = "High-Density Board Fabrication Techniques",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "306--317",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A variety of construction methods can be used to form
high-density printed-circuit boards. The electrical and
mechanical requirements of a design strongly influence
the choice of processes used to produce the finished
product. The introduction of physically large
high-density boards required the development of many
new processes, several of which are critical to the
electrical performance of the composite. In this paper
the process sequence employed in the fabrication of the
3081 high-density board is described, with particular
emphasis on the selection of the critical processes
used in its manufacture. The 3081 registration system
is also discussed, and a new method for merging
through-hole location data with the data representing
the location of the conducting layers is presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210D (Printed circuit
manufacture)",
classification = "703; 713; 721; 722; 723",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 registration system; boards; circuits; conducting
layers; construction; electronic equipment manufacture;
fabrication; high-density printed-circuit; manufacture;
mechanical requirements; packaging; PCB; printed;
printed circuits; through-hole location data",
treatment = "A Application; N New Development; P Practical",
}
@Article{Babuka:1982:DIT,
author = "R. Babuka and G. J. {Saxenmeyer, Jr.} and L. K.
Schultz",
title = "Development of Interconnection Technology for
Large-Scale Integrated Circuits",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "318--327",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The size, cost, reliability, and serviceability of
modern large data processing systems are influenced by
the electrical interconnections required among the
hundreds or thousands of chips they contain. The
development of the complex inteconnection design scheme
is profoundly influenced by the interactions among the
component and subassembly designs: modules,
printed-circuit boards, cables, connectors, etc. The
design scheme is also strongly affected by the
constraints imposed by manufacturing process
limitations and by environmental factors, such as
cooling and corrosion. This paper deals with these
interactions and constraints as encountered in the
interconnection design of the IBM 3081 system and the
design discipline required to deal with them.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B0170N (Reliability);
B2180E (Connectors); B2570 (Semiconductor integrated
circuits)",
classification = "713; 721; 722; 723",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boards; chips; circuit reliability; computers ---
Circuits; connectors; cooling; corrosion; data
processing systems; design scheme; electric connectors;
electrical interconnections; electronic; environmental
factors; equipment manufacture; IBM 3081; integrated
circuits; interconnection design scheme; large; large
scale integration; large-scale integrated circuits;
LSI; manufacturing process; modules; printed-circuit;
reliability",
treatment = "A Application; P Practical",
}
@Article{Koch:1982:ILP,
author = "J. H. {Koch III} and W. F. Mikhail and W. R. Heller",
title = "Influence on {LSI} Package Wireability of via
Availability and Wiring Track Accessibility",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "328--341",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experiments are reported which use automatic global
and line-packing wiring routines, supplemented by a
restricted maze runner, to evaluate the overall
influences of several important physical variables upon
the wireability of several logic-circuit package types.
The logic circuits are contained in subpackages (e.g.,
modules carrying chips), which are inserted, using
pins, into the carrier package in a regular array of
holes otherwise available as vias interconnecting the
wiring planes. Over a range of connection counts from
several hundred to several thousand, it is found that
``overflows'' (connections not wired by the program)
amounting to as much as 10 or 15\% of the wires can be
substantially reduced in number by careful design. This
can be done by using a sufficient number of
programmable vias (greater than one per used pin) and
by using a track grid ensuring maximum global track
accessibility to all pins, or by a combination of both
of these tactics in conjunction with suitable wiring
algorithms. Some simple theoretical arguments are given
which characterize the design problem in the light of
the results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210B (Printed circuit
layout and design); B2570 (Semiconductor integrated
circuits)",
classification = "713; 714; 721",
corpsource = "IBM General Technol. Div., East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "global; integrated circuits; large scale integration;
line-packing wiring; logic circuits; LSI package
wireability; modules; packaging; programmable vias;
restricted maze; runner; track accessibility; via
availability; wiring",
treatment = "P Practical; X Experimental",
}
@Article{Vilkelis:1982:LRA,
author = "W. V. Vilkelis",
title = "Lead Reduction Among Combinatorial Logic Circuits",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "342--348",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper provides a description of the behavior of
lead reduction among combinatorial logic circuits.
Methods by which one may design the lead reduction
architecture for modular packaging schemes are
developed. The methods are then applied to the design
of the lead reduction architecture of an integrated
circuit chip and a nine-chip cell.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B1265B (Logic circuits);
B2570 (Semiconductor integrated circuits); C5120 (Logic
and switching circuits)",
classification = "713; 721; 722",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "combinatorial circuits; combinatorial logic circuits;
computers --- Circuits; gate array; integrated circuit
chip; integrated logic circuits; large; lead reduction;
logic circuits; LSI; modular packaging schemes;
modules; nine-chip cell; packaging; scale integration;
Si masterslice",
treatment = "A Application; P Practical",
}
@Article{Davidson:1982:EDH,
author = "E. E. Davidson",
title = "Electrical Design of a High Speed Computer Package",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "349--361",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A methodology for optimizing the design of an
electrical packaging system for a high speed computer
is described. The pertinent parameters are first
defined and their sensitivities are derived so that the
proper design trade-offs can ultimately be made. From
this procedure, a set of rules is generated for driving
a computer aided design system. Finally, there is a
discussion of design optimization and circuit and
package effects on machine performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); C5420 (Mainframes and
minicomputers)",
classification = "713; 721",
corpsource = "IBM General Technol. Div., East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided design system; computers --- Circuits;
design optimization; design trade-offs; digital
computers; electrical; electrical design; high speed
computer; integrated circuits; LSI chip
interconnection; machine; packaging; packaging system;
performance",
treatment = "P Practical",
}
@Article{Fried:1982:VBM,
author = "L. J. Fried and J. Havas and J. S. Lechaton and J. S.
Logan and G. Paal and P. A. Totta",
title = "A {VLSI} Bipolar Metallization Design with Three-Level
Wiring and Area Array Solder Connections",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "362--371",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The ability to interconnect large numbers of
integrated silicon devices on a single chip has been
greatly aided by a three-level wiring capability and
large numbers of solderable input\slash output
terminals on the face of the chip. This paper describes
the design and process used to fabricate the
interconnections on IBM's most advanced bipolar
devices. Among the subjects discussed are thin film
metallurgy and contacts, e-beam lithography and
associated resist technology, a high temperature
lift-off stencil for metal pattern definition,
planarized RF sputtered SiO$_2$ insulation\slash
passivation, the ``zero-overlap'' via hole innovation,
in situ RF sputter cleaning of vias prior to
metallization, and area array solder terminals.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2550G (Lithography); B2570B (Bipolar integrated
circuits)",
classification = "713; 721; 722",
corpsource = "IBM General Technol Div., East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "area array solder connections; beam lithography;
bipolar integrated circuits; cleaning; computers ---
Circuits; contacts; e-; electron beam; electron beam
lithography; high temperature lift-; in situ RF
sputter; input/output terminals; integrated circuit
technology; integrated circuits; large scale
integration; lithography; logic circuits; metal pattern
definition; metallisation; off stencil; passivation;
planarised RF; resist technology; Si integrated
circuits; solderable; sputtered SiO$_2$; thin film
metallurgy; three-level; VLSI bipolar metallization
design; wiring; zero overlap via hole",
treatment = "N New Development; P Practical",
}
@Article{Howard:1982:OIA,
author = "Robert T. Howard",
title = "Optimization of Indium-Lead Alloys for Controlled
Collapse Chip Connection Application",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "372--378",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents the results of development studies
leading to the use of a low-indium solder alloy for C-4
applications. This alloy overcomes all previous
concerns while exceeding the fatigue life specification
of the high-indium alloy. Also described are the
variables and tests used to evaluate C-4 performance of
In-Pb alloys over the 5\% to 50\% range. Results are
presented graphically and mathematically to show the
improvement obtained with indium-content solders over
the conventional tin-lead alloys.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2240 (Microassembly techniques)",
classification = "721; 723",
corpsource = "IBM General Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "application; C-4 applications; computers; controlled
collapse chip connection; fatigue life; In-Pb alloys;
indium alloys; integrated circuit technology; lead
alloys; logic circuits; microassembling; solder alloy;
soldering; solders",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Getten:1982:IWS,
author = "J. R. Getten and R. C. Senger",
title = "Immersion Wave Soldering Process",
journal = j-IBM-JRD,
volume = "26",
number = "3",
pages = "379--382",
month = may,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Immersion wave soldering is a new technique for
soldering advanced printed circuit boards. In this
process, an assembled and fixtured printed circuit
board is immersed in a fluxing fluid and preheated to
the soldering temperature. The fluxing fluid is
glycerine activated with ethylenediamine tetra-acetic
acid (EDTA). After preheating and while still immersed
in the fluxing fluid, the fixtured board is passed over
a tin-bismuth eutectic (42\% Sn, 58\% Bi) solder wave.
This technique has several advantages over conventional
soldering processes, including elimination of solder
dross formation, improved control over solder
deposition, reduced thermal shock, easier cleaning
after soldering, and improved flux effectiveness.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170G (General fabrication techniques); B2210D
(Printed circuit manufacture)",
classification = "538; 703; 713",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electronic equipment manufacture; fluxing fluid;
glycerine; immersion wave soldering process; PCB;
printed circuit boards; printed circuits; Sn-Bi
eutectic solder; soldering; wave",
treatment = "A Application; N New Development; P Practical",
}
@Article{Agnew:1982:MIM,
author = "P. W. Agnew and A. S. Kellerman",
title = "Microprocessor Implementation of Mainframe Processors
by Means of Architecture Partitioning",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "401--412",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper examines several methods for applying LSI
and microprocessors to the design of processors of
increasing performance and complexity, and describes a
number of specific approaches to microprocessor-based
LSI implementation of System\slash 370 processors. The
most successful approaches partition the System\slash
370 instruction set into subsets, each of which can be
implemented by microcode on a special microprocessor or
by programs written for an off-the-shelf
microprocessor.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220 (Computer architecture)",
classification = "713; 714; 721; 723",
corpsource = "IBM Corp., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture partitioning; computer architecture;
computer operating systems --- Program Processors;
computers, microprocessor; integrated circuits ---
Large Scale Integration; large scale integration; LSI;
mainframe; microcode; microprocessor chips; processors;
System/370",
}
@Article{Mintzer:1982:MSP,
author = "Fred Mintzer and Abraham Peled",
title = "A microprocessor for signal processing, the {RSP}",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "413--423",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The organization and architecture of the Real-Time
Signal Processor are described. Features of the RSP,
such as the instruction pipeline and the fractional
fixed-point arithmetic, which exploit the
characteristics of signal processing to provide
additional computational power, are emphasized. Other
features, such as the powerful indexing, the saturation
arithmetic, the guard bits, and the double-word-width
accumulator, which add much to the processor's
versatility and programmability, are also highlighted.
The performance of the RSP is illustrated through
examples.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5130 (Microprocessor chips); C5220 (Computer
architecture); C5260 (Digital signal processing)",
classification = "721; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture; computer architecture; computer systems,
digital --- Real Time Operation; computerised signal
processing; computers, microprocessor; data processing;
double-word-width accumulator; fixed-point arithmetic;
fractional; guard bits; instruction pipeline;
microprocessor architecture; microprocessor chips;
organization; real-time signal processor; real-time
systems; saturation arithmetic",
treatment = "A Application; P Practical",
}
@Article{Cooley:1982:RTD,
author = "James W. Cooley",
title = "Rectangular Transforms for Digital Convolution on the
Research Signal Processor",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "424--430",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Convolution calculations by the RT method were
programmed for the Research Signal Processor (RSP) and
run on the RSP simulator, giving tabulations of numbers
of RSP machine cycles. One of the original objectives
was to see how well the original RSP architecture was
suited to the RCC algorithms and to be able to make
suggestions for possible changes. The results are also
intended to demonstrate the efficiency of the RT
convolution algorithms on a microprocessor with a
limited instruction set and to show how to construct
efficient RT programs for digital convolution.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260 (Digital signal processing)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems --- Program Processors;
computer programming; computerised; computerised signal
processing; data processing; digital convolution;
processor; rectangular transform; reduced computational
complexity algorithms; research signal; signal
processing; transforms",
treatment = "T Theoretical or Mathematical",
}
@Article{Davies:1982:RSP,
author = "Ken Davies and Fred Ris",
title = "Real-Time Signal Processor Software Support",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "431--439",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Real-Time Signal Processor (RSP) is a
microprocessor optimized to provide fast,
cost-efficient processing for signal processing
applications. In order for the RSP to become fully
useful, a complete set of software support tools needed
to be developed. The hardware design and software
development, which took place between 1978 and 1980,
resulted in many architectural features which minimized
hardware complexity at the expense of programmability.
This paper describes the tools that were developed and
the decisions that were involved, and includes
hindsight comments on what was done. Particular
emphasis is placed on the most interesting aspects of
the software development, i.e., how the special
architectural features of the RSP were handled to make
the overall hardware\slash software system more
programmable.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260 (Digital signal processing); C6150 (Systems
software)",
classification = "721; 722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer software; computer systems, digital --- Real
Time Operation; computerised signal processing;
computers, microprocessor; programmability; real-time;
signal processor; software development; software
support; systems software",
}
@Article{Dix:1982:CCU,
author = "G. L. Dix and M. D. Brown",
title = "Common Chip for Use in Disk and Diskette Controllers",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "440--445",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The advent of LSI technology makes common
microprogrammable controllers very cost-effective
today. This paper focuses on the application of
microcontrollers for disk and diskette control
functions and describes a custom-designed FET chip
which is being developed for use in these types of
controllers. The architecture, the functional
organization, and the physical design of this chip are
presented, and the requirement of matching a
microcontroller to the application is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570H
(Other field effect integrated circuits); C5320
(Digital storage); C7420 (Control engineering
computing)",
classification = "721",
corpsource = "IBM Corp., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computerised control; computers, digital; controllers;
custom-designed FET chip; disk; diskette; field effect
integrated circuits; LSI; magnetic disc; magnetic disc
and drum storage; matching; microcontrollers;
microprocessor chips; microprogrammable controllers;
storage",
treatment = "A Application; P Practical",
}
@Article{Correale:1982:PDC,
author = "Anthony Correale",
title = "Physical Design of a Custom 16-bit Microprocessor",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "446--453",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The physical chip design aspects of a 16-bit,
single-chip, custom-macro-designed microprocessor are
described. This microprocessor represents the IBM
System Products Division's highest-density VLSI FET
processor design to date. The chip is a complex
arrangement of over 6500 VLSI circuits utilizing a
state-of-the-art polysilicon-gate HMOS-1
(high-performance MOS) technology. The physical design
of this chip required the use of a comprehensive
methodology, from conception through completion. The
methodology used in the design of the microprocessor
was based on a hierarchical approach and is presented
in this paper.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570F
(Other MOS integrated circuits); C5130 (Microprocessor
chips); C5210 (Logic design methods)",
classification = "713; 714; 721; 723",
corpsource = "IBM Corp., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "16-; bit, single-chip, custom-macro-designed
microprocessor; computers, microprocessor; field effect
integrated circuits; hierarchical approach; IBM;
integrated circuits; large scale integration; logic
design; microprocessor chips; physical chip design;
polysilicon gate HMOS-1 technology; System Products;
VLSI/FET",
treatment = "P Practical",
}
@Article{Campbell:1982:DCV,
author = "John E. Campbell and Joseph Tahmoush",
title = "Design Considerations for a {VLSI} Microprocessor",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "454--463",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The 50-mm four-chip air-cooled microprocessor module
is packaged on a printed-circuit card with associated
repowering circuits and high-speed random-access
memory. Important design considerations and tradeoffs
associated with the development of this machine, within
specific cost, performance, reliability, and schedule
objectives, are discussed. Various processor design
techniques are described which minimize hardware where
performance is not critical. A degree of functional
parallelism is utilized, as well as timing flexibility,
to attain the required performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570B
(Bipolar integrated circuits); C5130 (Microprocessor
chips); C5210 (Logic design methods)",
classification = "713; 714; 721; 723",
corpsource = "IBM Corp., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture; bipolar integrated circuits; bipolar
VLSI microprocessor; computers, microprocessor; design;
flexible; four-chip air-cooled microprocessor;
functional parallelism; integrated channel; integrated
circuits --- Very Large Scale Integration;
interrupt-driven; large scale integration; logic;
microprocessor chips; module; modules; storage
interface; timing flexibility; VLSI",
treatment = "P Practical",
}
@Article{Mathews:1982:BCD,
author = "K. F. Mathews and L. P. Lee",
title = "Bipolar Chip Design for a {VLSI} Microprocessor",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "464--474",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A pseudo-custom approach to bipolar VLSI chip design
is presented, and a hierarchical structure of logic
macros assembled from building blocks is described. A
strategy of placing the logic macros along with
algorithmically designed PLA structures and ROS with a
placement aid, and of wiring the placement with an
automatic wiring program, is discussed. The paper also
focuses on the implementation of this strategy in terms
of technology, chip structure, and chip design
methodology. In addition, chip statistics are presented
and their implications are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570B
(Bipolar integrated circuits); C5130 (Microprocessor
chips); C5210 (Logic design methods)",
classification = "713; 714; 721; 723",
corpsource = "IBM Corp., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar integrated circuits; bipolar VLSI chip design;
chip statistics; chip structure; computers,
microprocessor; design; hierarchical structure of
logic; integrated circuits --- Very Large Scale
Integration; large scale integration; logic; logic
design; macros; microprocessor chips; pseudo-custom
design; technology; VLSI microprocessor",
treatment = "P Practical",
}
@Article{Tran:1982:VDV,
author = "Arnold S. Tran and Richard A. Forsberg and Jack C.
Lee",
title = "A {VLSI} design verification strategy",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "475--484",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The strategy discussed in this paper exploits the best
attributes of the two traditional methods of design
verification (i.e., software simulation and hardware
modeling). Software simulation was chosen for its
capability in the area of delay analysis and early
functional checking. An automatically generated
nodal-equivalent hardware model was built to provide
the vehicle on which exhaustive functional checking
could be performed. The model also operated as early
user hardware on which functions such as operating
systems, I/O adapters, and a floating-point feature
could be tested.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5130 (Microprocessor chips); C5210B (Computer-aided
logic design)",
classification = "721; 723",
corpsource = "IBM Corp., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems --- Program Processors;
hardware; integrated circuits; interface emulation;
large scale integration; logic CAD; logic testing;
microprocessor chips; modelling; parallel debut;
software simulation; verification strategy; VLSI
design",
treatment = "P Practical",
}
@Article{McCabe:1982:BVC,
author = "J. F. McCabe and A. Z. Muszynski",
title = "Bipolar {VLSI} Custom Macro Physical Design
Verification Strategy",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "485--496",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a design verification strategy
and its implied constraints on chip design. The
rationale for comparing the logic equivalence of the
high-level logical models to the low-level-device
physical models is presented, a description of the
hierarchical logical-to-physical and electrical
checking is given, and its impact on cost and
complexity is examined.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570B
(Bipolar integrated circuits); C5130 (Microprocessor
chips); C5210B (Computer-aided logic design)",
classification = "713; 714; 721; 723",
corpsource = "IBM Corp., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar integrated circuits; CAD; chips; complexity;
computers, microprocessor --- Design; cost; custom
bipolar VLSI; equivalence; high-level logical models;
integrated circuits; large scale integration; logic;
logic CAD; logic testing; low-level-device; macro;
microprocessor chips; physical and electrical design
validation; physical design verification strategy;
physical models",
treatment = "P Practical",
}
@Article{Mescia:1982:PAS,
author = "N. C. Mescia and C. D. Woods",
title = "Plant Automation in a Structured Distributed System
Environment",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "497--505",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper, the design and implementation of a
hierarchical distributed system for manufacturing
control of integrated electronic components are
described. The implementation includes distributed data
bases and inter-level decoupling to ensure 24-hour
manufacturing capabilities. Reasons for the choice of
the processors used at various levels in the
hierarchical network, and the communications required
between them, are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); C3355
(Control applications in manufacturing processes);
C6150J (Operating systems); C7420 (Control engineering
computing)",
classification = "713; 721; 723",
corpsource = "IBM Corp., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided manufacturing; control; data systems;
distributed data bases; distributed processing;
hierarchical distributed system; IBM; integrated
circuit; integrated circuit manufacture; integrated
circuits --- Very Large Scale Integration; inter-level
decoupling; large scale integration; logic devices;
manufacture; manufacturing; manufacturing computer
control; structured distributed system environment;
VLSI electronic components",
treatment = "A Application",
}
@Article{Franaszek:1982:CBD,
author = "P. A. Franaszek",
title = "Construction of Bounded Delay Codes for Discrete
Noiseless Channels",
journal = j-IBM-JRD,
volume = "26",
number = "4",
pages = "506--514",
month = jul,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94B60",
MRnumber = "84g:94018",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "499.94020",
abstract = "Algorithms are described for constructing synchronous
(fixed rate) codes for discrete noiseless channels
where the constraints can be modeled by finite state
machines. The methods yield two classes of codes with
minimum delay or look-ahead.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bounded delay codes; codes; codes, symbolic; discrete;
finite state machines; minimum delay; minimum
look-ahead; noiseless channels; periodic; stationary
codes; synchronous fixed rate codes",
reviewer = "Ram Autar",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Carre:1982:SMT,
author = "H. Carre and R. H. Doxtator and M. C. Duffy",
title = "Semiconductor manufacturing technology at {IBM}",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "528--531",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B2550
(Semiconductor device technology); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM France, Corbeil-Essonnes, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automated logistics; crystals growth; dispositioning;
integrated circuit; integrated circuit manufacture;
large scale integration; quality control; semiconductor
manufacturing processes; technology; VLSI production",
treatment = "G General Review; P Practical",
}
@Article{Stapper:1982:EAV,
author = "C. H. Stapper and P. P. Castrucci and R. A. Maeder and
W. E. Rowe and R. A. Verheilst",
title = "Evolution and accomplishments of {VLSI} yield
management at {IBM}",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "532--545",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0140 (Administration and management); B0170L
(Inspection and quality control); B2570H (Other field
effect integrated circuits)",
corpsource = "General Technol. Div., IBM, Burlington Faculty, Essex
Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "64K-bit random access memory chip; circuits; electric
monitoring techniques; fault levels; FET semiconductor
products; field effect integrated circuits; inspection;
integration; large scale; long-range forecasting;
manufacturing lines; monitoring; partially functional
products; planning; redundant; self-checking; visual;
VLSI yield management; yield models",
treatment = "G General Review; P Practical",
}
@Article{Murgai:1982:OIP,
author = "A. Murgai and W. J. Patrick and J. Combronde and J. C.
Felix",
title = "Oxygen incorporation and precipitation in
{Czochralski-grown} silicon",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "546--552",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6475 (Solubility, segregation, and mixing); A8110F
(Crystal growth from melt); A8130M (Precipitation);
B0510 (Crystal growth); B2520C (Elemental
semiconductors); B2550 (Semiconductor device
technology)",
corpsource = "General Technol. Div., IBM, East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "annealing; crucible rotation; crystal growth from
melt; crystal-melt; Czochralski method; elemental
semiconductors; growth parameters; hot zones; interface
position; O incorporation; O precipitation;
precipitation; procedures; semiconductor growth; Si
crystal growth; silicon; unpopulated nucleation sites",
treatment = "X Experimental",
}
@Article{Rottmann:1982:MMM,
author = "H. R. Rottmann",
title = "Metrology in mask manufacturing (for {LSI})",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "553--556",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2570 (Semiconductor integrated
circuits)",
corpsource = "General Technol. Div., IBM, East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "focus control; integrated circuit technology; large
scale integration; masks; microlithography; monolithic
integrated circuits; optical field sizes; optical
microscopy; registration failure; registration
stability; stepped-mask exposure systems",
treatment = "P Practical; X Experimental",
}
@Article{Frasch:1982:FSC,
author = "P. Frasch and K. H. Saremski",
title = "Feature size control in {IC} manufacturing ({LSI})",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "561--567",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Germany, Sindelfingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2-micron lithography ground rules; circuit-feature
dimensions; device density; dimensional; IC
manufacturing; integrated circuit manufacture; large
scale integration; LSI; manufacturing environment;
photolithography; variations",
treatment = "P Practical",
}
@Article{Bohlen:1982:EPP,
author = "H. Bohlen and J. Greschner and J. Keyser and W. Kulcke
and P. Nehmiz",
title = "Electron-beam proximity printing --- a new high-speed
lithography method for submicron structures",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "568--579",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Germany, Sindelfingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chip-size; electron beam lithography; electron-beam
proximity printer; exposure speed; high-speed
lithography; large scale integration; linewidth
resolution; LSI; masks; positional accuracy;
structures; submicron; transmission masks",
treatment = "N New Development; P Practical",
}
@Article{Bergendahl:1982:OPP,
author = "A. S. Bergendahl and S. F. Bergeron and D. L. Harmon",
title = "Optimization of plasma processing for silicon-gate
{FET} manufacturing applications",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "580--589",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550E (Surface treatment for semiconductor devices);
B2550G (Lithography); B2560S (Other field effect
devices)",
corpsource = "General Technol. Div., IBM, Burlington Facility, Essex
Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "anisotropic etching; experimentation; field effect
transistors; isotropic etching; optimisation;
photoresist; photoresists; plasma processing;
response-surface analysis techniques; semiconductor
technology; Si-gate FETs; sputter etching;
statistically designed multiparametric; stripping",
treatment = "A Application; P Practical",
}
@Article{Halverson:1982:MSL,
author = "R. M. Halverson and M. W. MacIntyre and W. T.
Motsiff",
title = "The mechanism of single-step liftoff with
chlorobenzene in a diazo-type resist",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "590--595",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
corpsource = "General Technol. Div., IBM, Burlington Facility, Essex
Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "casting; chlorobenzene single-step; diazo-type resist;
integrated circuit technology; integrated circuits;
liftoff process; metallisation; metallization;
monolithic; photoresists; resin species; resist film;
rinse cycle; soaking cycle; solvent",
treatment = "P Practical",
}
@Article{Collins:1982:PCC,
author = "G. G. Collins and C. W. Halsted",
title = "Process control of the chlorobenzene single-step
liftoff process with a diazo-type resist",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "596--604",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2550G (Lithography); B2570 (Semiconductor integrated
circuits); C3350Z (Control applications in other
industries)",
corpsource = "IBM Japan Ltd., Shiga, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chlorobenzene single-step liftoff process;
chlorobenzene soaking; diazo-type; electron microscope;
integrated circuit technology; integrated circuits;
manufacturing lines; metallisation; monolithic;
photoresist liftoff image; photoresists;
post-application baking; process control; process
controls; resist; scanning; SEM photographs",
treatment = "A Application; P Practical",
}
@Article{Burgess:1982:SFT,
author = "R. M. Burgess and K. B. Koens and E. M. {Pignetti,
Jr.}",
title = "Semiconductor final test logistics and product
dispositioning systems",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "605--612",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B2570
(Semiconductor integrated circuits); B7210B (Automatic
test and measurement systems); C3350Z (Control
applications in other industries); C7410D (Electronic
engineering computing)",
corpsource = "General Technol. Div., IBM, East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic testing; batch processing (industrial);
bipolar; computerized tracking; final test logistics
system; integrated circuit testing; integrated
circuits; product dispositioning systems; production;
semiconductor line; semiconductor wafer; shippable
product batches; testing",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Melan:1982:QRA,
author = "E. H. Melan and R. T. Curtis and J. K. Ho and J. G.
Koens and G. A. Snyder",
title = "Quality and reliability assurance systems in {IBM}
semiconductor manufacturing",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "613--624",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control); B0170N
(Reliability)B2570 (Semiconductor integrated circuits);
C3350Z (Control applications in other industries)",
corpsource = "Data Systems Div., IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar logic manufacturing; control; feed-forward;
integrated circuit manufacture; large scale
integration; manufacturing; monolithic integrated
circuits; process control; process control techniques;
process profile; QC systems; quality; reliability;
reliability assurance systems; semiconductor;
technique; VLSI FET memory device line",
treatment = "A Application; P Practical",
}
@Article{Shedler:1982:RSN,
author = "Gerald S. Shedler and Jonathan Southard",
title = "Regenerative simulation of networks of queues with
general service times: {Passage} through subnetworks",
journal = j-IBM-JRD,
volume = "26",
number = "5",
pages = "625--633",
month = sep,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K25 (62F25 68C15)",
MRnumber = "84f:60132",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "486.68018",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140C (Queueing theory); C4290 (Other computer
theory); C5420 (Mainframes and minicomputers)",
corpsource = "Res. Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "closed networks; confidence intervals; estimates;
general service times; generalized semi-Markov process;
irreducible; linear job stack; Markov processes;
method; multiprocessing systems; passage times; point;
queueing theory; regenerative simulation; state
vector",
treatment = "T Theoretical or Mathematical",
}
@Article{Wong:1982:DAS,
author = "K. Y. Wong and R. G. Casey and F. M. Wahl",
title = "{Document Analysis System}",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "647--656",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7240 (Information analysis and indexing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "classification; clustering; computer; Document
Analysis System; encoding; font sizes; front styles;
information analysis; linear adaptive classification
scheme; pattern-matching method; processing;
run-length; segmentation; smoothing algorithm",
treatment = "P Practical",
}
@Article{Casey:1982:ASD,
author = "R. G. Casey and T. D. Friedman and K. Y. Wong",
title = "Automatic scaling of digital print fonts",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "657--666",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "contour smoothness; digital; dot matrices; fonts;
global symmetries; local symmetries; photocomposer;
print character quality; print fonts; printers;
printing; raster-based printers; scaling; stroke
width",
treatment = "A Application; P Practical",
}
@Article{Abdou:1982:ALI,
author = "I. E. Abdou and K. Y. Wong",
title = "Analysis of linear interpolation schemes for bi-level
image applications",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "667--680",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290F (Interpolation and function approximation);
B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition); C4130
(Interpolation and function approximation)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bi-level; coarse scan; fine print; image;
interpolation; linear interpolation schemes; picture
processing; polynomial functions; polynomials; pulse
functions; quantization effects; signal models; step
functions",
treatment = "T Theoretical or Mathematical",
}
@Article{Brickman:1982:WAR,
author = "N. F. Brickman and W. S. Rosenbaum",
title = "{Word Autocorrelation Redundancy Match} ({WARM})
technology",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "681--686",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210H (Facsimile transmission); C7100 (Business and
administration)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "character level; complex symbol; correlation methods;
data compression; facsimile; facsimile technology;
image compression capability; intelligent; matching;
redundancy; textual documents; WARM; Word
Autocorrelation Redundancy Match; word level; word
processing",
treatment = "A Application; P Practical",
}
@Article{Anastassiou:1982:DHI,
author = "D. Anastassiou and K. S. Pennington",
title = "Digital halftoning of images",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "687--697",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bilevel images; clusters; contouring; digital gray
scale images; digital halftoning; edge enhancement;
halftoning algorithm; moire; parallel implementation;
parallel processing; patterns; picture processing",
treatment = "T Theoretical or Mathematical",
}
@Article{Danielsson:1982:ISC,
author = "P.-E. Danielsson",
title = "An improved segmentation and coding algorithm for
binary and nonbinary images",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "698--707",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "binary images; border following; coding; contour;
encoding; following; island; nonbinary images; object
following; picture processing; pixels; raster scanning;
segmentation",
treatment = "T Theoretical or Mathematical",
}
@Article{Kriz:1982:RDR,
author = "T. A. Kriz",
title = "Reduced data re-order complexity properties of
polynomial transform {2D} convolution and {Fourier
Transform} methods",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "708--714",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition); C7410F
(Communications computing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2D Fourier; array processor units; computerised
picture processing; data processing; digital
processing; execution time; Fourier transforms; image
processing; matrix data reorder requirements; modified
ring polynomial transform methods;
polynomial-transform-based 2D convolution; polynomials;
power-of-2 length-; structures; Transform methods",
treatment = "T Theoretical or Mathematical",
}
@Article{Dave:1982:IHC,
author = "J. V. Dave and R. Bernstein and H. G. Kolsky",
title = "Importance of higher-order components to multispectral
classification (Landsat image data)",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "715--723",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B6140C
(Optical information, image and video signal
processing); B7710 (Geophysical techniques and
equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "classification; color composites; digital terrain
elevation data; dimensionality; geophysical techniques;
information extraction; Landsat multispectral image;
multispectral classification; picture processing;
procedures; remote sensing",
treatment = "A Application; X Experimental",
}
@Article{Jimenez:1982:SEI,
author = "J. Jimenez and J. L. Navalon",
title = "Some experiments in image vectorization",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "724--734",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6140C (Optical information, image and
video signal processing); C1250 (Pattern recognition)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cartography; contour following; digital images;
encoding; line thinning; Map Manipulation; picture
processing; polygonal approximation; System;
vectorization algorithms",
treatment = "X Experimental",
}
@Article{Montoto:1982:DMA,
author = "L. Montoto",
title = "Digital multi-image analysis: application to the
quantification of rock microfractography",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "735--734",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9160B (Mechanical and acoustic properties of rocks,
minerals and soil); A9385 (Instrumentation and
techniques for geophysical, hydrospheric and lower
atmosphere research)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "crack detection; digital multiimage analysis;
fluorescence; geology; microcrack types;
microfissuration; micrographs; microscopy; picture
processing; polarizing; rock microfractography; rocks",
treatment = "A Application; X Experimental",
}
@Article{Farrell:1982:BAI,
author = "E. J. Farrell",
title = "Backscatter and attenuation imaging from ultrasonic
scanning in medicine",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "746--758",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8760B (Sonic and ultrasonic radiation (medical
uses)); A8770E (Patient diagnostic methods and
instrumentation); B7510B (Radiation and radioactivity
applications in biomedicine)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "attenuation imaging; backscatter; beamwidth;
biomedical ultrasonics; cross-coupling artifacts;
distortion; image; image iteration; medicine; patient
diagnosis; reconstruction; simulated echo data;
speckle; three-parameter model; ultrasonic scanning",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Barnes:1982:ASP,
author = "E. R. Barnes",
title = "An algorithm for separating patterns by ellipsoids",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "759--764",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90C05",
MRnumber = "84f:90050",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "504.68058",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ellipsoids; feature space; finite-dimensional
Euclidean; pattern recognition; pattern separation;
space",
treatment = "T Theoretical or Mathematical",
}
@Article{Tappert:1982:CSR,
author = "C. C. Tappert",
title = "Cursive script recognition by elastic matching",
journal = j-IBM-JRD,
volume = "26",
number = "6",
pages = "765--771",
month = nov,
year = "1982",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1180 (Optimisation techniques); C1250
(Pattern recognition); C5530 (Pattern recognition and
computer vision equipment)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "coordinate data; cursive script; dynamic programming;
elastic matching; electronic tablet; letter
recognition; letter segmentation; letter sequence;
nonlinear time warping; pattern recognition;
recognition; technique; time sequences; x-y",
treatment = "A Application; P Practical; T Theoretical or
Mathematical",
}
@Article{Cleverley:1983:PQL,
author = "Donald S. Cleverley",
title = "Product Quality Level Monitoring and Control for Logic
Chips and Modules",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "4--10",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper defines an absolute number for product
defects, called ``product quality level'' (PQL). PQL
categories found in logic chips and modules after
completion of electrical testing are described and a
methodology for the monitoring and control of the PQL
in chips is presented. The impact of chip defects on
module, card, and system performances is discussed with
the aid of examples. By using the described
comprehensive design, process control, testing, and
user-feedback approach at each assembly level, final
product can be manufactured with the lowest possible
level of defects that must then be repaired at the
machine level.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control); B1265B (Logic
circuits)",
classification = "713; 721; 722; 723",
corpsource = "IBM General Technol. Div., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "controls; inspection; integrated logic circuits; level
of defects; logic chips; logic design; logic modules;
logic testing; manufacturing process; modules;
monitoring; PQL categories; product assembly; product
reliability; quality control; quality levels",
treatment = "P Practical",
}
@Article{Burger:1983:MCM,
author = "William G. Burger and Charles W. Weigel",
title = "Multi-Layer Ceramics Manufacturing",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "11--19",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Multi-layer ceramics (MLC) is an advanced packaging
technology developed by IBM and used in the IBM 4300
and IBM 3081 processor models to significantly improve
the module circuit density, reliability, and
performance over those of previous packages. A key
element in this package is the MLC substrate, which is
capable of supporting more than 100 semiconductor chips
in some design uses. The MLC manufacturing facility
requires that sophisticated processing and
inspection\slash test equipment operate within a
hierarchically integrated system. This paper provides
an overview of the manufacturing process that has been
implemented to satisfy the high-volume manufacturing
needs of this complex package. It also describes the
data handling systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B0540 (Ceramics and
refractories (engineering materials science))",
classification = "713; 721; 722; 723",
corpsource = "IBM General Technol. Div., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081; ceramics; IBM; IBM 4300; inspection/test
equipment; integrated circuit manufacture; MLC
substrate; module circuit density; modules; multilayer
ceramics; packaging; packaging technology;
reliability",
treatment = "A Application; P Practical",
}
@Article{Sanborn:1983:PNC,
author = "Malcolm A. Sanborn",
title = "Precise Numerical Control for the Thermal Conduction
Module",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "20--26",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Automated manufacturing processes have been developed
and put into practice for the high-volume production of
the thermal conduction module, the high-density circuit
package used in the IBM 3081 processor models. The very
precise work required on the ceramic surface required
the solution of many problems. The small but
significant residual distortions (warpage) which
resulted from firing the multi-layer ceramic substrates
made it difficult to locate tooling precisely for
subsequent processes. A unique scheme for measuring the
module and precalculating numerical control data has
made it possible to achieve full automation. The nature
of the problem, the attempts at a simple solution, and
the algorithms finally used for numerical control data
calculation are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); C3355 (Control
applications in manufacturing processes); C7410D
(Electronic engineering computing); C7420 (Control
engineering computing)",
classification = "713; 721; 722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated manufacturing processes; computerised
numerical control; control; high-density circuit;
high-volume production; IBM 3081 processor models;
integrated circuit manufacture; manufacturing computer;
module; modules; numerical control data; package;
packaging; thermal conduction; tooling; warpage",
treatment = "P Practical",
}
@Article{Curtin:1983:MMT,
author = "James J. Curtin and John A. Waicukauski",
title = "Multi-Chip Module Test and Diagnostic Methodology",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "27--34",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The development of a manufacturing test and diagnostic
methodology for multi-chip modules as used in the IBM
4300 processor models involves determining the most
attractive compromise among a number of conflicting
factors: (a) high test coverage; (b) high diagnostic
resolution, (c) test generation, (d) test equipment,
and (e) test application and diagnosis. This paper
describes a set of solutions which were developed to
create a high-volume, low-cost manufacturing test
operation for the product in question. This paper
examines the role of the testing methodology in
productivity and product quality, details the
diagnostic approach chosen, and provides an example of
the overall manufacturing system performance achieved
by analyzing a large module production sample.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B0170L
(Inspection and quality control); B2210D (Printed
circuit manufacture)",
classification = "713; 721; 722; 723",
corpsource = "IMB General Technol. Div., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "diagnostic methodology; electronic equipment testing;
equipment; IBM 4300 processor models; integrated
circuit testing; manufacturing; modules; multichip
modules; printed circuits; product; production testing;
productivity; quality; quality control; test; test
generation; testing methodology",
treatment = "P Practical",
}
@Article{Pierson:1983:LTT,
author = "Roland L. Pierson and Thomas B. Williams",
title = "{LT1280} for Through-The-Pins Testing of the Thermal
Conduction Module",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "35--40",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Testing the thermal conduction module (TCM), the
high-density field-replaceable unit (FRU) used in the
IBM 3081 processor models, and diagnosing the faults
encountered to a minimal repairable set of entities
posed a new problem for the IBM engineers. The
requirement and the economic necessity of thoroughly
exercising the entire TCM logic and random access
memory (RAM) array structure through the input\slash
output pins of the TCM are discussed. This is followed
by a description of the test system alternatives and
the LT1280 left bracket logic tester having 1280
input\slash output (I/O) pins right bracket as the
selected TCM manufacturing test system. The TCM logic
density and high I/O count required new concepts of
test system organization, size, and complexity to
achieve a test and diagnostic system with high
flexibility and high throughput capability.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B0170L (Inspection and
quality control); B1265 (Digital electronics); B7210B
(Automatic test and measurement systems)",
classification = "713; 721; 722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 processor models; automatic test equipment;
cellular arrays; conduction module; density;
high-density field-replaceable unit; IBM; input/output;
integrated circuit testing; logic; logic array; logic
tester; logic testing; LT1280; manufacturing test
system; minimal repairable set; modules; packaging;
pins; RAM array; thermal; through-the-pins testing",
treatment = "A Application; P Practical",
}
@Article{Barry:1983:FDL,
author = "Patricia Latus Barry",
title = "Failure Diagnosis on the {LT1280}",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "41--49",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The high-density circuitry and I/O pin population of
the thermal conduction module (TCM), the VLSI package
used in the IBM 3081 processor models, dictates that
there be a precise and cost-effective method of
detecting and diagnosing TCM defects. This paper
describes the challenge faced in testing the logic and
random access memories of the TCM and the diagnostic
approach used in the LT1280 test system for testing the
TCM through its I/O pins. The generation and
application of tests are discussed, and the automated
multiple-defect diagnostic (AMDD) algorithm is
presented in detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B1265 (Digital electronics);
B7210B (Automatic test and measurement systems)",
classification = "713; 721; 722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 processor models; automated; automatic test
equipment; cellular arrays; failure analysis;
high-density circuitry; I/O pin; IBM; integrated
circuit testing; large scale integration; logic
testing; LT1280 test system; multiple-defect
diagnostic; population; RAM arrays; random-access;
storage; thermal conduction module; VLSI package",
treatment = "P Practical",
}
@Article{Baldwin:1983:CCO,
author = "Edwin C. Baldwin and Steven M. DeFoster and Mark A.
West and Richard A. Ziegler",
title = "Computer-Controlled Optical Testing of High-Density
Printed-Circuit Boards",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "50--58",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The increased densities of multi-layer printed-circuit
boards have required development of unique approaches
to product testing. An optical automatic inspection
system developed to test interplanes of the
printed-circuit board used in the IBM 3081 processor
(TCM board) is described. This system scans the
features of the product and locates surface defects of
25.4 $\mu$ m (1 mil) or larger through changes in
reflectivity. It is capable of finding over 90\% of the
errors on subtractively plated printed-circuit
interplanes, as well as shorts and opens of 50 $\mu$ m
or more on glass masters of printed-circuit boards.
Alternative approaches to the inspection problem are
discussed, together with the technical trade-offs which
were made that led to the final system configuration.
The tester theory and some hardware\slash software
trade-offs are also covered.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control); B2210D
(Printed circuit manufacture); B7210B (Automatic test
and measurement systems)",
classification = "703; 713; 721; 722; 723",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated inspection system; automatic test equipment;
computer-controlled optical testing; density
printed-circuit boards; final; high-; IBM 3081
processor; inspection; integrated circuit testing ---
Automatic Testing; interplanes; multilayer PCBs;
nondestructive; printed circuits; production testing;
surface defects; system configuration; testing",
treatment = "A Application; P Practical",
xxauthor = "M. A. West and S. M. DeFoster and E. C. Baldwin and R.
A. Ziegler",
}
@Article{Dooley:1983:MPA,
author = "Brian J. Dooley",
title = "Model for the Prediction of Assembly, Rework, and Test
Yields",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "59--67",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A simulation model based on the concepts described in
this paper was implemented as a means for studying the
behavior of different assembly\slash test methodologies
and to predict the throughput capabilities of various
manufacturing configurations. By adopting a different
simulation philosophy, the model was greatly
simplified, and by taking advantage of the matrix
processing features of APL, modeling changes required
due to procedure or test-equipment changes could easily
be implemented. This paper reviews the philosophy of
the simulation of computer part assembly, takes a new
look at modeling, and describes the architectural
concepts embodied in the implementing program. It also
details some of the more important concepts needed to
complete the simulator.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7160 (Manufacturing and industrial administration);
C7430 (Computer engineering)",
classification = "713; 721; 722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3081 processors; APL; assembly; assembly/test
methodologies; computer testing; digital simulation; DP
industry; features; field-replaceable units; IBM;
integrated circuits; manufacturing data processing;
manufacturing planning effort; matrix processing;
model; rework; simulation; test yields",
treatment = "P Practical",
}
@Article{Smith:1983:TNA,
author = "F. D. Smith and C. H. West",
title = "Technologies for Network Architecture and
Implementation",
journal = j-IBM-JRD,
volume = "27",
number = "1",
pages = "68--78",
month = jan,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses some of the fundamental
properties of network architectures such as SNA, and
the evolution of formal descriptive methods that
provide precise, complete definitions of the
architecture. This has culminated in the development of
a programming language, Format and Protocol Language
(FAPL), tailored for programming a reference model or
metaimplementation of an SNA node. In this form, the
architecture specifications is itself
machine-executable.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques); C6140E (Other programming
languages)",
classification = "723",
corpsource = "IBM Communication Products Div., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer networks; distributed processing; distributed
processors; FAPL; Format and Protocol Language;
languages; meta-implementation; network software;
programming; programming language; protocol validation;
protocols; reference model; software technologies;
Systems Network Architecture",
treatment = "P Practical",
}
@Article{Martin:1983:ACC,
author = "G. Nigel N. Martin and Glen G. {Langdon, Jr.} and
Stephen J. P. Todd",
title = "Arithmetic Codes for Constrained Channels",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "94--106",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "528.94012",
abstract = "Arithmetic codes have been studied in the context of
compression coding, i.e., transformations to code
strings which take up less storage space or require
less transmission time over a communications link.
Another application of coding theory is that of
noiseless channel coding, where constraints on strings
in the channel symbol alphabet prevent an obvious
mapping of data strings to channel strings. An
interesting duality exists between compression coding
and channel coding. The source alphabet and code
alphabet of a compression system correspond,
respectively, to the channel alphabet and data alphabet
of a constrained channel system. The decodability
criterion of compression codes corresponds to the
representability criterion of constrained channel
codes, as the generalized Kraft Inequality has a dual
inequality due to the senior author.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
classification = "723; 731",
corpsource = "IBM UK Labs. Ltd., Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arithmetic codes; channel alphabet; channel symbol
alphabet; code alphabet; codes; codes, symbolic; coding
theory; communication channels; communications link;
compression coding; constrained channels; criterion;
data alphabet; data compression; decodability;
information theory --- Channel Capacity; source
alphabet; storage space; transmission time",
treatment = "T Theoretical or Mathematical",
}
@Article{Todd:1983:GFR,
author = "Stephen J. P. Todd and Glen G. {Langdon, Jr.} and G.
Nigel N. Martin",
title = "A general fixed rate arithmetic coding method for
constrained channels",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "107--115",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "528.94013",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); B6120B (Codes); C1260
(Information theory)",
corpsource = "IBM UK Sci. Centre, Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "codes; communication channels; constrained channels;
encoding; general fixed rate arithmetic coding",
treatment = "T Theoretical or Mathematical",
}
@Article{Franchi:1983:DIA,
author = "Paolo Franchi and Jorge Gonzalez and Patrick Mantey
and Carlo Paoli and Albertao Parolo and John Simmons",
title = "Design Issues and Architecture of Hacienda, an
Experimental Image Processing System",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "116--126",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper provides the rationale for the architecture
and design of a color image display and processing
system called HACIENDA. The system was heavily
influenced by one of its most important intended
applications, the processing of LANDSAT data, including
that to be provided by LANDSAT D. Also considered in
the paper are the trade-offs involved in making the
system suitable for a broader range of image processing
work without unduly adding to cost or complexity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); B7260 (Display technology and systems);
C5260 (Digital signal processing)",
classification = "723; 741",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architecture; colour image display system;
computerised picture processing; design; display
instrumentation; HACIENDA; image processing; LANDSAT D;
LANDSAT data; system",
treatment = "P Practical; X Experimental",
}
@Article{Santisteban:1983:PCS,
author = "Antonio Santisteban",
title = "Perceptual Color Space of Digital Image Display
Terminals",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "127--132",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The geometric properties of the set of colors that can
be displayed on the TV monitor of a digital image
processing terminal are discussed in the framework of
the Commission Internationale de l'Eclairage (CIE) 1976
(L*u*v*) color space. Quantitative results are
presented for the HACIENDA image processing system. The
use of lightness, chroma, and hue angle for the
representation of multi-band images is briefly
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); B7260 (Display technology and systems)",
classification = "723; 741",
corpsource = "Centro Cientifico, IBM, Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chroma; computerised picture processing; digital image
display terminals; display devices; geometric
properties; HACIENDA image processing; image
processing; interactive terminals; lightness;
perceptual color space; system; TV monitor",
treatment = "P Practical",
}
@Article{Fagin:1983:FCS,
author = "Ronald Fagin and John Hayden Williams",
title = "A fair carpool scheduling algorithm",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "133--139",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Authors present a simple carpool scheduling algorithm
in which no penalty is assessed to a carpool member who
does not ride on any given day. The algorithm is shown
to be fair, in a certain reasonable sense. The amount
of bookkeeping grows only linearly with the number of
carpool members.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290H (Systems theory applications in
transportation)",
classification = "913; 921",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bookkeeping; fair carpool scheduling algorithm;
scheduling; transportation",
treatment = "T Theoretical or Mathematical",
}
@Article{Miranker:1983:ZTV,
author = "Glen S. Miranker and Luong Tang and Chak Kuen Wong",
title = "``Zero-Time'' {VLSI} Sorter",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "140--148",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A hardware sorter suitable for VLSI implementation is
proposed. It operates in a parallel and pipelined
fashion, with the actual sorting time absorbed by the
input\slash output time. A detailed VLSI implementation
is described which has a very favorable device count
compared to existing static RAM.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5150 (Other circuits for digital computers); C6130
(Data handling techniques)",
classification = "713; 723",
corpsource = "Valid Logic Systems Inc., Sunnyvale, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data processing; hardware sorter; integrated circuits,
VLSI; large scale integration; logic design; parallel
processing; pipeline; pipeline processing; processing;
sorting; static RAM; zero-time VLSI sorter",
treatment = "P Practical",
}
@Article{Koppelman:1983:OSI,
author = "George M. Koppelman and Michael A. Wesley",
title = "{Oyster}: a Study of Integrated Circuits as
Three-Dimensional Structures",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "149--163",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a design for a software system
(OYSTER) for the parametric simulation and analysis of
the fabrication steps of very large scale integrated
circuit devices. The system is based on a solid
geometric modeling approach in which the component
parts of an integrated circuit are represented at any
step as three-dimensional solid objects in a geometric
data base. The simulation of a fabrication step
transforms the data base representation of the geometry
and the relations among component parts from their
state before the step to their state after the step. At
any step, and particularly after the final step, the
component parts may be analyzed automatically to
determine geometric, mechanical, thermal, and
electrical properties.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits); C7410D (Electronic engineering computing)",
classification = "713; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit analysis computing; device; electrical
properties; FET; integrated circuit manufacture;
integrated circuits; large scale integration;
mechanical properties; modeling approach; OYSTER;
parametric simulation; planar masks; software system;
solid geometric; thermal properties; three-dimensional
structures; VLSI devices",
treatment = "P Practical",
}
@Article{Voldman:1983:FNS,
author = "Jean Voldman and Benoit Mandelbrot and Lee W. Hoevel
and Joshua Knight and Philip L. Rosenfeld",
title = "Fractal Nature of Software-Cache Interaction",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "164--170",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper uses fractals to model the clustering of
cache misses. The clustering of cache misses can be
quantified by a single number analog to a fractional
dimension, and we are intrigued by the possibility that
this number can be used as a measure of software
complexity. The essential intuition is that cache
misses are a direct reflection of changes in locality
of reference, and that complex software requires more
frequent (and larger) changes in this locality than
simple software. The cluster dimension provides a
measure (and perhaps the basis for a model) of the
intrinsic differences between workloads. This paper
focus on cache miss activity as a discriminate between
interactive and batch environments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory)",
classification = "723",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "batch environments; clustering; computational
complexity; computer software; fractal nature;
interactive environments; modelling; software
complexity; software-cache interaction",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Bugdayci:1983:AMR,
author = "Nur Bugdayci and David B. Bogy and Frank E. Talke",
title = "Axisymmetric Motion of Radially Polarized
Piezoelectric Cylinders Used in Ink Jet Printing",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "171--180",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An analysis of the low frequency response of
piezoelectric squeeze tubes used in drop-on-demand ink
jet printing is carried out. The displacements at inner
and outer boundaries are determined as a function of
voltage and fluid pressure. The results are used to
obtain fluid pressure per applied voltage as a function
of inner and outer radius. Numerical computations are
carried out for PZT-5H, and results are presented in
graphical form which can be used to optimize design
dimensions. The effect of finite electrode thickness is
also studied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2860 (Piezoelectric and ferroelectric devices)",
classification = "714; 745",
corpsource = "Univ. of California, Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "axisymmetric motion; electrode thickness; finite;
fluid pressure; ink jet printing; numerical
computations; piezoelectric devices; piezoelectric
squeeze tubes; polarized piezoelectric cylinders;
printers; printing; PZT-5H; radially",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Lew:1983:IRC,
author = "John S. Lew",
title = "Improved Regional Correlation Algorithm for Signature
Verification Which Permits Small Speed Changes Between
Handwriting Segments",
journal = j-IBM-JRD,
volume = "27",
number = "2",
pages = "181--185",
month = mar,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The presently used intersegment distance permits
certain natural data transformations. A new
intersegment distance is proposed which permits further
natural transformations: translating a segment by a
fraction of the sampling interval; and writing at
slightly different uniform speed within each segment.
The new distance, like the old one, is the minimum of a
certain function. An algorithm is described which
computes this minimum.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B6140C
(Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acceleration components; accelerometers; character
recognition; data transformations; handwriting
segments; orthogonal; pattern recognition; pen axis;
regional correlation algorithm; signal processing;
signature verification",
treatment = "T Theoretical or Mathematical",
}
@Article{Padegs:1983:SEA,
author = "Andris Padegs",
title = "{System\slash 370} Extended Architecture: Design
Considerations",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "198--205",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A review is given of the overall objectives and the
design considerations that led to the System\slash 370
Extended Architecture (370-XA). It presents an overview
of the differences between the System\slash 370 and
370-XA architectures and summarizes all architectural
extensions, deletions, and changes. Then it describes
in more detail the extensions for interpretive
execution, 31-bit addressing, protection, tracing,
inter-CPU communications, and extended-precision
floating-point division. Refs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "722; 723",
corpsource = "Information Systems and Technol. Group, IBM,
Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "31-bit addressing; computer architecture;
considerations; design; extended-precision;
floating-point division; inter-CPU communications;
interpretive execution; multiple virtual storage;
operating systems; operating systems (computers);
protection; System/370 architecture; System/370
Extended Architecture; System/370 extended architecture
(370-XA); tracing; virtual storage",
treatment = "N New Development; P Practical",
}
@Article{Cormier:1983:SEA,
author = "R. L. Cormier and Robert J. Dugan and Richard R.
Guyette",
title = "{System\slash 370} Extended Architecture: the Channel
Subsystem",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "206--218",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "THE 370-XA channel subsystem architecture represents a
significant extension of the corresponding System\slash
370 architecture. This paper examines the need for
these extensions, discusses the important features and
facilities of the new architecture, and provides
comparisons with its predecessor, the System\slash 370
channel architecture. It also describes, from an
operational viewpoint, how these new concepts affect
I/O processing and how they relate to the current trend
toward using multiple CPUs, increasing CPU execution
speed, and increasing the number of I/O attachments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "722; 723",
corpsource = "Information Systems and Technol. Group, IBM,
Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "channel subsystem; computer architecture; I/O;
multiple CPUs; processing; System/370 architecture;
System/370 Extended Architecture; System/370 extended
architecture (370-XA)",
treatment = "N New Development; P Practical",
}
@Article{Comfort:1983:FSA,
author = "Webb T. Comfort",
title = "Fault-Tolerant System Architecture for {Navy}
Applications",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "219--236",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A description is given of the architecture of a
computer system, being designed and built for the U. S.
Navy, that is expected to be the standard Navy
shipboard computer for the next twenty years or so. It
has a requirement for very high system reliability,
which is addressed by a multiprocessor system
configuration that can recover dynamically from
hardware faults and support on-line repair of failed
hardware elements. The overall system architecture and
a number of significant new features designed to
support fault-tolerant operation are discussed,
including a duplex control bus, a computer
interconnection system, a technique for remote
diagnostics, a single-button maintenance procedure, and
special fault-handling software.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5220
(Computer architecture); C5420 (Mainframes and
minicomputers)",
classification = "404; 672; 722; 723",
corpsource = "Federal Systems Div., IBM, Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AN/UYK-43; application programs; computer; computer
architecture; computer interconnection system; computer
programming; computers, microprocessor; duplex control
bus; fault tolerant computing; fault-handling software;
fault-tolerant system architecture; interconnection
system; maintenance procedure; military equipment;
multiprocessor system; naval vessels; navy
applications; Navy shipboard computer; on-line repair;
reliability; remote diagnostics; single-button;
single-button maintenance procedure; system",
treatment = "A Application; P Practical",
}
@Article{Radin:1983:M,
author = "George Radin",
title = "The 801 Minicomputer",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "237--246",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An overview is provided of an experimental system
developed at the IBM Thomas J. Watson Research Center.
It consists of a running hardware prototype, a control
program, and an optimizing compiler. The basic concepts
underlying the system are discussed, as are the
performance characteristics of the prototype. In
particular, three principles are examined: (1) system
orientation towards the pervasive use of high-level
language programming and a sophisticated compiler, (2)
a primitive instruction set which can be completely
hard-wired, and (3) storage hierarchy and I/O
organization to enable the CPU to execute an
instruction at almost every cycle.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5420
(Mainframes and minicomputers)",
classification = "722; 723",
corpsource = "System Products Div., IBM, White Plains, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "801 minicomputer; compiler; computer architecture;
computer programming; computers, miniature; control
program; hardware prototype; high-level; I/O
organization; IBM 801 minicomputer; instruction set;
language programming; minicomputers; optimizing
compiler; performance characteristics; storage
hierarchy",
treatment = "P Practical",
}
@Article{Rao:1983:IMO,
author = "Gururaj S. Rao and Philip L. Rowenfeld",
title = "Integration of Machine Organization and Control
Program Design --- Review and Direction",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "247--256",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A discussion is given of the relationship between
machine organization and control program design in
high-end commercial computer systems. The criterion is
cost\slash performance subject to achieving an
acceptable performance level. A brief discussion of the
environment expected for the design and operation of
high-end commercial computer systems is outlined,
followed by a discussion of machine organization
techniques, which are classified and reviewed to permit
a qualitative evaluation of the degree to which control
program intent is exploited in machine organization.
The thesis is developed next, by using a hierarchical
model which illustrates the contention, that
architecture has acted as a barrier to communication
between the control program and machine organization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "723",
corpsource = "Data Systems Div., IBM, White Plains, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; computer systems programming;
control program; control program design;
cost/performance; hierarchical model; high-end
commercial computer systems; machine organisation
integration; machine organization; memory hierarchy;
qualitative evaluation",
treatment = "P Practical",
}
@Article{Wright:1983:DCA,
author = "Robert E. Wright",
title = "Documenting a Computer Architecture",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "257--264",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The documentation of a computer architecture requires
that special conditions be satisfied in its preparation
to ensure exactness, consistency, and completeness. One
group in IBM, Central Systems Architecture, has spent
many years refining procedures for producing quality
documentation of this type, most notably for the
System\slash 370 architecture and the System\slash 370
Extended Architecture (370-XA). The steps this group
performs in documenting a computer architecture, the
requirements identified for the finished description,
and the procedures followed to satisfy those
requirements are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C6110 (Systems analysis
and programming)",
classification = "722; 723",
corpsource = "Information Systems and Technol. Group, IBM,
Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "completeness; computer architecture; consistency;
documentation; exactness; program and system
documentation; System/370 architecture; System/370
Extended Architecture; System/370 extended architecture
(370-XA)",
treatment = "P Practical",
}
@Article{Eichelberger:1983:RCE,
author = "Edward B. Eichelberger and Eric Lindbloom",
title = "Random-Pattern Coverage Enhancement and Diagnosis for
{LSSD} Logic Self-Test",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "265--272",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Embedded linear feedback shift registers can be used
for a logic component self-test. The issue of test
coverage is addressed by circuit modification, where
necessary, of random-pattern-resistant fault nodes.
Also given is a procedure that supports net-level
diagnosis for structured logic in the presence of
random test-pattern generation and signature
analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5210 (Logic design
methods)",
classification = "721",
corpsource = "Data Systems Div., IBM, Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "diagnosis; embedded linear feedback shift registers;
level diagnosis; level-sensitive scan design; linear
feedback shift registers; logic circuits; logic design;
logic self-test; logic testing; LSSD logic self-test;
net-; programmable logic array; random test-pattern
coverage; random-pattern coverage enhancement;
signature analysis; structured logic",
treatment = "P Practical; X Experimental",
}
@Article{Hendriks:1983:BCM,
author = "Ferdinand Hendriks",
title = "Bounce and Chaotic Motion in Impact Print Hammers",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "273--280",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A lumped-parameter description is given of an impact
printer actuator of the stored-energy type. All
constants necessary to describe the actuator and the
ribbon\slash paper pack are derived from measurements.
The equations of motion are integrated both for
single-and multiple-current pulse excitation. The
numerical results show that for low repetition rates,
each impact is distinct and independent, but at higher
rates the impacts interact.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 921",
corpsource = "General Products Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bounce; computer peripheral equipment; cycle times;
flight-time; impact print hammers; impact printer
actuator; impact printing; lumped-parameter
description; mathematical models; Poincare plots;
Poincar{\'e} plots; print-force; printers;
stored-energy actuator; variations",
treatment = "P Practical",
}
@Article{Langlois:1983:DSM,
author = "William E. Langlois and Ki-Jun Lee",
title = "Digital Simulation of Magnetic {Czochralski} Flow
Under Various Laboratory Conditions for Silicon
Growth",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "281--284",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Previous digital simulations have suggested that an
axial magnetic field in the 0.1-T (1000-Gs) range can
effectively suppress convection in the Czochralski
growth of silicon. The present paper treats the matter
more quantitatively by investigating the convection in
a variety of flow conditions corresponding to typical
Czochralski growth of silicon on a laboratory scale.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7280C (Conductivity of elemental semiconductors);
A8110F (Crystal growth from melt); B0510 (Crystal
growth); B2520C (Elemental semiconductors); C7410D
(Electronic engineering computing)",
classification = "549; 701; 801; 802; 942",
corpsource = "Res. Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "axial magnetic field; convection; crystal growth from
melt; crystals --- Growing; Czochralski flow; digital
simulation; digital simulations; elemental; elemental
semiconductor; flow; magnetic Czochralski; magnetic
field effects; magnetic fields; semiconductors; Si
growth; silicon; silicon and alloys",
treatment = "P Practical",
}
@Article{Wrenner:1983:LMP,
author = "Warren R. Wrenner",
title = "Large Multi-Layer Panel-Drilling System",
journal = j-IBM-JRD,
volume = "27",
number = "3",
pages = "285--291",
month = may,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A description is given of the mechanical, electrical,
and control features of an advanced, four-station,
twelve-spindle, large-printed-circuit panel-drilling
system. The system was designed as a production tool to
produce over 35,000 0.4-mm-diameter holes in a panel
containing twenty layers of copper and nineteen layers
of epoxy glass. Built around a precision, four-station,
x-y positioning system with three motor-driven spindles
over each work station, the system includes a
minicomputer, a printer, a display station, and a
controller\slash interface station. Drilling
parameters, such as infeed, outfeed, top of stroke,
bottom of stroke, and spindle revolution rates, are all
computer-controlled.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture); C3355C (Control
applications in machining processes and machine tools);
C7420 (Control engineering computing)",
classification = "544; 603; 713; 723; 817",
corpsource = "General Technol. Div., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided manufacturing; computerised control;
control features; controller/interface; copper and
alloys; display station; drills; electrical features;
epoxy glass; epoxy resins; four-station x-y positioning
system; integrated circuit manufacture; large
multilayer panel-drilling system; machine tools;
mechanical features; minicomputer; printed circuits;
printer; production tool; spindle revolution rates;
station",
treatment = "A Application; P Practical",
}
@Article{Lyerla:1983:HCN,
author = "J. R. Lyerla and C. S. Yannoni",
title = "High-Resolution Carbon-13 {NMR} of Polymers in the
Solid State",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "302--312",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A review is presented of the salient features of the
methods used for resolution and sensitivity enhancement
in **1**3C NMR spectra of solids. Performance
characteristics of the unique variable-temperature
cross-polarization magic angle spinning (VT-CPMAS)
apparatus developed in the laboratory are given. The
authors present results of structural studies on
fluoropolymers using this technique, and discuss the
issue of intensities in cross-polarized spectra. In
addition, results of an ongoing VT-CPMAS study of
polypropylene dynamics are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7660 (Nuclear magnetic resonance and relaxation);
A8280D (Electromagnetic radiation spectrometry
(chemical analysis))",
classification = "801; 815",
corpsource = "Dept. of Polymer Sci. and Technol., IBM Res. Div., San
Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "/sup; 13/C NMR spectra; cross-polarized spectra;
fluoropolymers; magic angle spinning; methods; NMR
spectroscopy; nuclear magnetic resonance; performance;
polymers; polypropylene dynamics; resolution
enhancement; reviews; salient features; sensitivity
enhancement; spectrochemical analysis; structural
studies; variable-temperature cross-polarization;
VT-CPMAS",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Clarke:1983:MAS,
author = "T. C. Clarke and J. C. Scott and G. B. Street",
title = "Magic Angle Spinning {NMR} of Conducting Polymers",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "313--320",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Because of their typically intractable nature,
conducting polymers as a class of materials have proved
particularly difficult to characterize by the
conventional techniques of polymer analysis. Examples
are presented of the application of a powerful new
tool, cross-polarization magic angle spinning (CMPAS)
**1**3C NMR spectroscopy, to the investigation of the
structure and reactions of the conducting polymers
polyacetylene and polypyrrole.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7660 (Nuclear magnetic resonance and relaxation)",
classification = "801; 815",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "/sup 13/C; analysis; conducting polymers; magic angle
spinning NMR; NMR spectroscopy; nuclear magnetic
resonance; polyacetylene; polymer; polymers;
polypyrrole; spectrochemical",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Geiss:1983:PSD,
author = "R. H. Geiss and G. B. Street and W. Volksen and J.
Economy",
title = "Polymer Structure Determination Using Electron
Diffraction Techniques",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "321--329",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The crystallographic structure of organic crystals is
most commonly studied using x-ray diffraction (XRD)
techniques. Unfortunately, rather large crystals, at
least 10**6 $\mu$ m**3, are required for XRD analysis,
and it often quite difficult and sometimes impossible
to prepare such large crystals. On the other hand,
electron diffraction techniques, although not nearly as
precise as XRD, do afford the capability of studying
much smaller crystals. The minimum size for electron
diffraction is on the order of 10** minus **3 $\mu$
m**3 (0.1 $\mu$ m**2 area by 0.01 $\mu$ m thick). Since
most polymer crystals are very sensitive to radiation
damage caused by the beam in the electron microscope,
special precautions must be taken to minimize beam
damage to the specimen. Our approach to minimizing
radiation damage, while still obtaining usable
diffraction data, is described in terms of using the
condenser-objective lens optics of the Philips 301
S(TEM) electron microscope. Three examples of the
application of electron diffraction structure analysis
are given. These include the structures of halogenated
polysulfur nitride (SN)$_x$, neutral alpha, alpha prime
-polypyrrole, and poly(p-hydroxybenzoic acid) (PHBA).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6114F (Experimental electron diffraction and
scattering); A6116D (Electron microscopy determinations
of structures); A6140K (Structure of polymers,
elastomers, and plastics)",
classification = "815; 933",
corpsource = "Dept. of Phys. Sci., IBM Res. Div., San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(Sn)$_x$; condenser-; crystal structure;
crystallographic structure; crystallography; crystals
--- Structure; determination; diffraction; electron
diffraction crystallography; electron diffraction
techniques; electron microscope examination of
materials; halogenated; minimizing radiation damage;
minimum crystal size; neutral alpha, alpha'-; objective
lens optics; organic crystals; PHBA;
poly(p-hydroxybenzoic acid); polymer crystals;
polymers; polypyrrole; polysulfur nitride; radiation
damage; structure; structure analysis; TEM;
transmission electron microscopy; X-ray; XRD",
treatment = "A Application; X Experimental",
}
@Article{Bargon:1983:ESE,
author = "Joachim Bargon and Shamsher Mohmand and Robert J.
Waltman",
title = "Electrochemical Synthesis of Electrically Conducting
Polymers from Aromatic Compounds",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "330--341",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Amorphous, electrically conducting polymeric films can
be deposited from acetonitrile solutions of specific
aromatic compounds containing an appropriate
electrolyte. Free-standing films peeled off a platinum
electrode have electrical conductivities sigma between
10** minus **3 and 1 OMEGA ** minus **1-cm** minus **1.
Polymers resembling the better-known polypyrrole have
been obtained from benzenoid, nonbenzenoid, and
heterocyclic monomers. A few characteristic examples
are discussed to highlight the characterization
efforts. Also discussed are the chemical investigations
which have provided some insight into the mechanism of
formation and the structure of these conducting
polymers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A6855 (Thin film growth, structure, and
epitaxy); A8115L (Deposition from liquid phases (melts
and solutions)); A8160J (Surface treatment and
degradation of polymers and plastics); A8235 (Polymer
reactions and polymerization); A8245 (Electrochemistry
and electrophoresis); B0520 (Thin film growth); B0560
(Polymers and plastics (engineering materials
science))",
classification = "801; 802; 815",
corpsource = "Dept. of Chem. Dynamics, IBM Res. Div., San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acetonitrile solutions; amorphous films; aromatic
compounds; benzenoid; characterization; chemical
reactions --- Oxidation; conducting polymers;
conductivities; electrical; electrically;
electrochemical synthesis; electrochemistry;
electrodeposition; electrolyte; electropolymerisation;
examples; free standing films; heterocyclic monomers;
nonbenzenoid; organic compounds; polymer films; polymer
synthesis; polymeric films; polymerisation; polymers;
polypyrrole; Pt electrode",
treatment = "P Practical; X Experimental",
}
@Article{Diaz:1983:MPE,
author = "A. F. Diaz and B. Hall",
title = "Mechanical Properties of Electrochemically Prepared
Polypyrrole Films",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "342--347",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The mechanical and conducting properties of
free-standing films of polypyrrole toluenesulfonate
depend on the preparation conditions. Films prepared in
aqueous ethylene glycol solvent mixtures show a
variation of two orders of magnitude in the
conductivity and of a factor of three in the tensile
strength.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A6220 (Mechanical properties of solids
(related to microscopic structure)); A7220 (Electrical
conductivity phenomena in semiconductors and
insulators); A8115L (Deposition from liquid phases
(melts and solutions)); A8160C (Surface treatment and
degradation of semiconductors); A8160J (Surface
treatment and degradation of polymers and plastics);
A8235 (Polymer reactions and polymerization); A8245
(Electrochemistry and electrophoresis)B0520 (Thin film
growth); B0560 (Polymers and plastics (engineering
materials science))",
classification = "801; 817",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aqueous ethylene; conducting; conductivity; electrical
conductivity of amorphous semiconductors and;
electrochemically prepared polypyrrole films;
electrochemistry; electrodeposition;
electropolymerisation; free-standing films; glycol
solvent mixtures; insulators; mechanical properties;
plastics films; polymer films; polymerisation;
polypyrrole; preparation conditions; properties;
tensile strength; toluenesulfonate",
treatment = "P Practical; X Experimental",
}
@Article{Hanchett:1983:EMC,
author = "V. E. Hanchett and R. H. Geiss",
title = "Electron Microscopy of Carbon-Loaded Polymers",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "348--355",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is very difficult to fully characterize the spatial
distribution of particles in carbon-loaded polymers
using traditional methods. One approach has been to
cross-section the polymers, using ultramicrotomy
techniques, to a thickness of 80-100 nm. These sections
are then examined in a transmission electron microscope
(TEM). Unfortunately, the information on particle
dispersion obtained from such images is essentially
two-dimensional in nature, and therefore does not lend
itself easily to a three-dimensional interpretation. By
increasing the thickness of the cross sections to 0.5
$\mu$ m or more, one is able to utilize stereoscopic
imaging techniques and obtain a three-dimensional image
of the carbon particle dispersion. In this way, the
characteristic dispersion of the carbon particles may
be fully evaluated along a particular direction in the
polymer film. Examples are given of the
three-dimensional analyses of polymer films containing
different carbon-particle loadings.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6116D (Electron microscopy determinations of
structures); B0560 (Polymers and plastics (engineering
materials science))",
classification = "741; 815",
corpsource = "Dept. of Phys. Sci., IBM Res. Div., San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "C particle dispersion; C-loaded polymers;
characteristic; dispersion; examination of materials;
filled polymers; morphology; polymers; stereoscopic
imaging; techniques; three-dimensional image;
transmission electron microscope",
treatment = "P Practical; X Experimental",
}
@Article{Farrell:1983:CDI,
author = "Edward J. Farrell",
title = "Color Display and Interactive Interpretation of
Three-Dimensional Data",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "356--366",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Three-dimensional results from engineering and
scientific computations often involve the display and
interpretation of a large volume of complex data. A
method is developed for color display of 3D data with
several interactive options to facilitate
interpretation. The method is based on representing
points whose values fall within a specified range as a
single hue. An image is formed by overlaying successive
2D frames with increasing hue lightness towards the
front. Interactive options to aid interpretations are
viewpoint, contour lines, multiple range display,
slicing, veiled surfaces, and stereo image pairs. The
display method is successfully applied to several types
of data. The overall structure and variations of the 3D
data are observable, as well as transients which may be
overlooked in a large input data set.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C5540 (Terminals and graphic displays);
C6130B (Graphics techniques); C7330 (Biology and
medical computing)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3D data; cathode-ray tube displays; color; computer
graphics; computerised; computerised tomography;
contour lines; display; frames; interactive
interpretation; interactive options; large input data
set; method; multiple range display; overlaying
successive 2D; picture processing; slicing; stereo
image pairs; three-dimensional data; transients; veiled
surfaces; viewpoint",
treatment = "A Application; P Practical; X Experimental",
}
@Article{McAuley:1983:RDI,
author = "David McAuley",
title = "Row-By-Row Dynamic Image Analysis of a Matrix of
Scanned Points",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "367--375",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A practical image analysis algorithm is described that
incorporates features to permit it to carry out its
analysis on a row-by-row basis, in contrast to a full
image matrix basis. A significant storage saving is
realized, since the total image to be scanned is
substantially larger than that used by this method. The
dynamic build-up of the image on a scan-by-scan or
row-by-row basis is carried out by a series of
connectivity, pivot, chain set-up, and chaining
algorithms used in conjunction with a dynamic memory
allocation strategy.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723",
corpsource = "IBM UK, Greenock, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chain set-up; chaining algorithms; computerised
pattern recognition; computerised picture processing;
connectivity; dynamic image analysis; dynamic memory
allocation strategy; image analysis algorithm; image
processing; image recognition; matrix of scanned
points; pivot algorithms; row by row analysis; saving;
storage",
treatment = "P Practical; X Experimental",
}
@Article{Wahl:1983:HOI,
author = "Friedrich Wahl and Samuel So and Kwan Wong",
title = "Hybrid Optical-Digital Image Processing Method for
Surface Inspection",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "376--385",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A hybrid measurement technique is proposed for
high-precision surface inspection. The technique uses
an interferometer to image microscopic surface defects.
In order to quantify the degree of various surface
defects, the interferograms are scanned, digitized, and
subsequently converted to a binary image by using an
adaptive thresholding technique which takes into
account the inhomogeneity of the imaging system. A new
misalignment measure for binary patterns identifies the
`straightness' of the fringe lines. It is shown that
the resulting percentages of misaligned picture
elements conform fairly well with the degree of various
surface defects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0760L
(Optical interferometry); B0170L (Inspection and
quality control); B6140C (Optical information, image
and video signal processing); B7320Z (Other nonelectric
variables measurement)C1260 (Information theory); C5260
(Digital signal processing); C7410F (Communications
computing)",
classification = "723; 931",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adaptive thresholding; binary image; computerised
picture processing; digitized interferograms; fringe
lines; high-; hybrid measurement technique; hybrid
optical-digital image; image; image processing;
inspection; interferograms; interferometer;
interferometry; light; microscopic surface defects;
misalignment measure; of misaligned picture elements;
percentages; precision surface inspection; processing
method; surface defects; surface topography
measurement; surfaces --- Inspection; technique",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Casey:1983:POS,
author = "R. G. Casey and C. R. Jih",
title = "A processor-based {OCR} system",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "386--399",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A low-cost optical character recognition (OCR) system
can be realized by means of a document scanner
connected to a CPU through an interface. The interface
performs elementary image processing functions, such as
noise filtering and thresholding of the video image
from the scanner. The processor receives a binary image
of the document, formats the image into individual
character patterns, and classifies the patterns
one-by-one. A CPU implementation is highly flexible and
avoids much of the development and manufacturing costs
for special-purpose, parallel circuitry typically used
in commercial OCR. A processor-based recognition system
has been investigated for reading documents printed in
fixed-pitch conventional type fonts, such as occur in
routine office typing. Novel, efficient methods for
tracking a print line, resolving it into individual
character patterns, detecting underscores, and
eliminating noise have been devised. A previously
developed classification technique, based on decision
trees, has been extended in order to improve reading
accuracy in an environment of considerable character
variation, including the possibility that documents in
the same font style may be produced using quite
different print technologies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250B (Character recognition); C7410F
(Communications computing)",
classification = "723; 741",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binary image; character; character recognition;
character recognition, optical; classification
technique; computerised OCR; computerised pattern
recognition; CPU implementation; decision trees;
detecting underscores; development cost reduction;
document reader; document scanner; elementary image
processing functions; eliminating; fixed-pitch
conventional type fonts; low-cost; manufacturing costs;
noise; noise filtering; OCR system; office automation;
optical; optical character recognition; parallel
circuitry; print line; processor-based; recognition
system; routine office typing; thresholding; tracking;
variation; video image",
treatment = "A Application; X Experimental",
}
@Article{White:1983:ITO,
author = "J. M. White and G. D. Rohrer",
title = "Image Thresholding for Optical Character Recognition
and Other Applications Requiring Character Image
Extraction",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "400--411",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Two new, cost-effective thresholding algorithms for
use in extracting binary images of characters from
machine-or hand-printed documents are described. The
creation of a binary representation from an analog
image requires such algorithms to determine whether a
point is converted into a binary one because it falls
within a character stroke of a binary zero because it
does not. This thresholding is a critical step in
Optical Character Recognition (OCR). It is also
essential for other Character Image Extraction (CIE)
applications, such as the processing of machine-printed
or handwritten characters from carbon copy forms or
bank checks, where smudges and scenic backgrounds, for
example, may have to be suppressed. The first
algorithm, a nonlinear, adaptive procedure, is
implemented with a minimum of hardware and is intended
for many CIE applications. The second is a more
aggressive approach directed toward specialized,
high-volume applications which justify extra
complexity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250B (Character recognition); C7410F
(Communications computing)",
classification = "723; 741",
corpsource = "Dept. of Advanced Technol., IBM Information Products
Div., Charlotte, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "applications; background suppression; bank checks;
bank cheques; carbon copy forms; character image
extraction; character recognition, optical; characters;
CIE; computerised pattern recognition; computerised
picture; extracting binary images; hand-; hardware;
high-volume applications; image thresholding; machine
printed; nonlinear adaptive procedure; OCR; optical
character; optical character recognition; printed
documents; processing; recognition; scenic backgrounds;
smudges; thresholding algorithms",
treatment = "A Application; X Experimental",
}
@Article{Fleisher:1983:ERB,
author = "Harold Fleisher and Morton Tavel and John Yeager",
title = "{Exclusive-OR} representations of {Boolean}
functions",
journal = j-IBM-JRD,
volume = "27",
number = "4",
pages = "412--416",
month = jul,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "With the goal of making exclusive-OR formulations of
switching functions more readily available to designers
for implementation in LSI and VLSI technologies, the
authors introduce the concept of an exclusive-OR space
in which an exclusive-OR normal form is defined to
correspond to the conventional disjunctive normal form.
A geometrical representation of exclusive-OR space is
described, and its various bases are listed and
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C4230 (Switching theory)",
classification = "722; 723",
corpsource = "IBM Data Systems Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Boolean functions; computer systems, digital;
conventional disjunctive normal form; EX-OR;
exclusive-OR representations; exclusive-OR space;
geometrical; logic design; representation; SLI;
switching functions; VLSI; XOR",
treatment = "N New Development; T Theoretical or Mathematical",
}
@Article{Milewski:1983:PSO,
author = "A. Milewski",
title = "Periodic Sequences with Optimal Properties for Channel
Estimation and Fast Start-Up Equalization",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "426--431",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problems of fast channel estimation and fast
start-up equalization in synchronous digital
communication systems are considered from the viewpoint
of the optimization of the training sequence to be
transmitted. Various types of periodic sequences having
uniform discrete power spectra are studied. Some of
them are new and may be generated with data sets
commonly used in phase modulation systems. As a
consequence of their power spectra being flat, these
sequences ensure maximum protection against noise when
initial equalizer settings are computed via channel
estimates and noniterative techniques.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); B6140 (Signal processing
and detection); B6210Z (Other data transmission); C5600
(Data communication equipment and techniques)",
classification = "718",
corpsource = "IBM France, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binary sequences; digital communication systems;
equalisers; fast channel estimation; fast start-up
equalization; noniterative techniques; optimisation;
periodic sequences; protection against noise; signal
processing; synchronous digital communication; systems;
training sequences optimisation; uniform discrete power
spectra",
treatment = "T Theoretical or Mathematical",
}
@Article{Park:1983:ATC,
author = "D. I.-H. Park and R. D. Love",
title = "Analysis of the Tolerance to Crosstalk Noise of a
Pulse Width Modulation System",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "432--439",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reports the results of an investigation to
determine the drive degradation caused by random noise
in a pulse width modulation (PWM) system originally
designed for communicating on coaxial cable but using
instead twisted-pair cables. Presented are the analysis
of the driver\slash receiver circuit, the theoretical
modeling of the transmitted waveforms over the
twisted-pair medium using ASTAP, and a methodology for
trading off rms noise for transmission capability. The
analysis of the effect of noise on drive distance as a
function of allowable error rate is derived, and an
example is provided. Finally, a simplified analysis
technique is proposed to allow rapid calculation of
approximate (yet conservative) results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120 (Modulation methods); B6210Z (Other data
transmission)",
classification = "716",
corpsource = "IBM Communications Products Div., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "allowable error; analysis technique; ASTAP; circuit;
coaxial cable; crosstalk; digital simulation; drive
degradation; drive distance; driver/receiver; pulse;
pulse width modulation; PWM; random noise; rate;
theoretical modeling; tolerance to crosstalk noise;
transmission capability; transmitted waveforms;
twisted-pair cables; width modulation system",
treatment = "T Theoretical or Mathematical",
}
@Article{Widmer:1983:DPT,
author = "A. X. Widmer and P. A. Franaszek",
title = "A {DC-Balanced}, Partitioned-Block, {8B\slash 10B}
Transmission Code",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "440--451",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a byte-oriented binary
transmission code and its implementation. This code is
particularly well suited for high-speed local area
networks and similar data links, where the information
format consists of packets, variable in length, from
about a dozen up to several hundred 8-bit bytes. The
proposed transmission code translates each source byte
into a constrained 10-bit binary sequence which has
excellent performance parameters near the theoretical
limits for 8B\slash 10B codes. The maximum run length
is 5 and the maximum digital sum variation is 6. A
single error in the encoded bits can, at most, generate
an error burst of length 5 in the decoded domain. A
very simple implementation of the code has been
accomplished by partitioning the coder into 5B\slash 6B
and 3B\slash 4B subordinate coders.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C5600 (Data communication equipment
and techniques); B6210Z (Other data transmission)",
classification = "723",
corpsource = "IBM Communication Product Div., Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "8B/10B codes; binary codes; binary sequences;
byte-oriented binary; codes; computer networks;
constrained 10-bit binary sequence; data links; DC
balanced code; encoding; errors; high-speed local area;
implementation; length; maximum digital sum variation;
maximum run; networks; packet switching;
partitioned-block code; performance; subordinate
coders; theoretical limits; transmission code",
treatment = "A Application; P Practical",
}
@Article{Francois:1983:SMP,
author = "P. Fran{\c{c}}ois and A. Potocki",
title = "Some Methods for Providing {OSI} Transport in {SNA}",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "452--463",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is made up of three parts: first, a review
of open systems interconnection (OSI) objectives,
followed by a comparison\slash contrasting of OSI and
systems network architecture (SNA) objectives; second,
a description of techniques for providing communication
between programs residing in systems based on different
architectures; and third, the possible application of
these techniques to the four lower OSI layers,
demonstrating some ways which could be used to provide
connectivity between SNA end users and other
heterogeneous system end users through OSI protocols.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques)",
classification = "723",
corpsource = "IBM France, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "between programs residing in systems; communication;
computer architecture; computer networks; computer
networks --- Protocols; objectives; OSI; SNA; systems
interconnection; systems network architecture",
treatment = "P Practical",
}
@Article{Franaszek:1983:ARL,
author = "P. A. Franaszek",
title = "Address-Independent Routing for Local Networks",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "464--471",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A routing methodology is introduced which permits
messages to be propagated throughout a network without
recourse to destination or origin addresses. Two
classes of networks, bidirectional trees and augmented
rings, are analyzed from this point of view. An
optimality property is proved for the bidirectional
tree, and three types of address-independent routing
strategies are derived. It is shown that augmented
loops, a class of structures incorporating redundant
links, may be rerouted to compensate for the failure of
any single node or link.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6150 (Communication system theory); B6210L (Computer
communications); C5620 (Computer networks and
techniques)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "address-independent routing strategies; augmented
loops; augmented rings; bidirectional trees; classes of
networks; computer networks; local networks; optimality
property; redundant links; routing methodology;
switching theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Iglehart:1983:SNM,
author = "Donald L. Iglehart and Gerald S. Shedler",
title = "Simulation of non-{Markovian} systems",
journal = j-IBM-JRD,
volume = "27",
number = "??",
pages = "472--480",
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "521.60092",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Iglehart:1983:SNS,
author = "Donald L. Iglehart and Gerald S. Shedler",
title = "Simulation of Non-{Markovian} Systems",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "472--480",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "60K15 (68C15 68J05)",
MRnumber = "84k:60115",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A generalized semi-Markov process provides a
stochastic process model for a discrete-event
simulation. This representation is particularly useful
for non-Markovian systems where it is nontrivial to
obtain recurrence properties of the underlying
stochastic processes. `Geometric trials' arguments can
be used to obtain results on recurrence and
regeneration in this setting. Such properties are
needed to establish estimation procedures based on
regenerative processes. Applications to modeling and
simulation of ring and bus networks are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240Z (Other topics in statistics); B6210L (Computer
communications); C1140Z (Other topics in statistics);
C5620 (Computer networks and techniques); C7410F
(Communications computing)",
classification = "723; 731",
corpsource = "Stanford Univ., Stanford, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bus networks; computer networks; control systems,
stochastic; digital simulation; discrete-event
simulation; estimation; generalised semiMarkov process;
geometric trials; modeling; nonMarkovian systems;
procedures; recurrence; regeneration; regenerative
processes; ring networks; stochastic process model;
stochastic processes",
treatment = "T Theoretical or Mathematical",
}
@Article{Strole:1983:LCN,
author = "Norman C. Strole",
title = "Local Communications Network Based on Interconnected
Token-Access Rings: a Tutorial",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "481--496",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is a tutorial of the fundamental aspects of
the architecture, physical components, and operation of
a token-ring LAN. Particular emphasis is placed on the
fault detection and isolation capabilities that are
possible, as well as the aspects that allow for network
expansion and growth. The role of the LAN relative to
IBM's Systems Network Architecture (SNA) is also
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620 (Computer
networks and techniques)",
classification = "723",
corpsource = "IBM Communication Products Div., Research Triangle
Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "area network; components; computer networks;
extendible; fault detection; fault isolation; fault
location; group of nodes; high-speed data transfer;
IBM's systems network architecture; interconnected
token-access rings; LAN; large networks; local; local
communications; network; network architecture; network
expansion; operation; physical; requirements; small
networks; SNA; star/ring wiring topology; token-access
control; tutorial",
}
@Article{Blaauw:1983:ORE,
author = "G. A. Blaauw and A. J. W. Duijvestijn and R. A. M.
Hartmann",
title = "Optimization of Relational Expressions Using a Logical
Analogon",
journal = j-IBM-JRD,
volume = "27",
number = "5",
pages = "497--519",
month = sep,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
ftp://ftp.ira.uka.de/pub/bibliography/Database/Wiederhold.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An expression applying to a relational database is
optimized by mapping the expression upon set
expressions which, in turn, are transformed into
logical expressions. These logical expressions then are
optimized, taking into account the constraints that are
inherent in relational expressions and the costs of
those expressions. Subsequently a reverse
transformation to relational expressions is applied.
The method is developed for the traditional relational
operators and is applicable to a variety of cost
criteria. Common subexpressions as well as redundant
expressions are optimized. A new relational operation
`split' is proposed that may be used effectively in an
optimized expression. Results obtained with a model for
the optimization method are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
annote = "relational expressions (including `exclusion') become
set expressions (using the Universal relation concept)
with only INTERSECT, UNION, and DIF., and then logical
expressions with AND, OR, and NOT. To facilitate
removal of common subexpressions a SPLIT operation is
introduced.",
classcodes = "C6160D (Relational databases)",
classification = "723; 922",
corpsource = "Dept. of Computer Sci., Twente Univ. of Technol.,
Enschede, Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "costs; database; database management systems; database
systems; logical analogon; logical expressions;
operators; optimisation; optimization; redundant
expressions; relational; relational expressions;
relational operation split; reverse transformation;
subexpressions; traditional relational",
review = "ACM CR 8404-297",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Gum:1983:SEA,
author = "P. H. Gum",
title = "{System\slash 370} Extended Architecture: Facilities
for Virtual Machines",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "530--544",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the evolution of facilities for
virtual machines on IBM System\slash 370 computers, and
presents the elements of a new architectural facility
designed for the virtual-machine environment. Assists
that have been added to various System\slash 370 models
to support the use of virtual machines are summarized,
and a general facility for this purpose which was
introduced with the System\slash 370 Extended
Architecture (370-XA) is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C7430 (Computer
engineering)",
classification = "723",
corpsource = "IBM Information Systems and Technol. Group,
Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "370-XA architecture; computer architecture; computers;
data storage, digital; dynamic address translation;
Extended Architecture; IBM System/370; privileged
instructions; virtual machines",
treatment = "P Practical",
}
@Article{Meister:1983:MYF,
author = "Bernd Meister",
title = "On {Murphy}'s Yield Formula",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "545--548",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Some properties of yield are presented, and one lower
and three upper bounds for yield are derived. Some of
these bounds represent yield formulas already known as
useful approximations. Pure Poisson statistics for
defect density provides the lower bound. The upper
bounds are obtained with mixtures of Poisson
distributions and a formula of Price and Stapper.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2570
(Semiconductor integrated circuits)",
classification = "921; 922",
corpsource = "IBM Res. Div., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuits; defect density; formula; integrated circuit
technology; lower bounds; mathematical techniques;
monolithic integrated; Murphy's yield; Poisson
statistics; Price and Stapper formula; probability;
statistical analysis; upper bounds",
treatment = "T Theoretical or Mathematical",
}
@Article{Stapper:1983:MIC,
author = "C. H. Stapper",
title = "Modeling of Integrated Circuit Defect Sensitivities",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "549--557",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper treats the fundamentals of the defect
models that have been used successfully at IBM for a
period of more than fifteen years. The effects of very
small defects are discussed first. The case of
photolithographic defects, which are of the same
dimensions as the integrated circuit device and
interconnection patterns, is dealt with in the
remainder of the paper. The relationships between these
models and tests sites are described. Data from
measurements of defect sizes are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)B2560B (Semiconductor device modelling and
equivalent circuits); B2570 (Semiconductor integrated
circuits)",
classification = "713; 921; 922",
corpsource = "IBM General Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "defect sizes; IBM; integrated circuit defect
sensitivities; integrated circuit manufacture; large
scale integration; mathematical models; monolithic ICs;
monolithic integrated circuits; photolithographic
defects; photolithography; semiconductor device models;
sites; test",
treatment = "T Theoretical or Mathematical",
}
@Article{Beichter:1983:SLS,
author = "F. Beichter and O. Herzog and H. Petzsch",
title = "{SLAN-4}: a Language for the Specification and Design
of Large Software Systems",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "558--576",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The language SLAN-4 has been defined in view of the
need for formal tools supporting the specification and
design of large software systems. It offers its users
language constructs for algebraic and axiomatic
specifications as well as for design in pseudocode. One
of its major design goals has been to ease subsequent
refinements of a (given) specification. The user can
start his development with an informal high-level
specification which can be formalized and implemented
at a later date by using lower-level concepts. This
paper provides the formal definitions of the SLAN-4
language, discusses the design decisions, and presents
examples for the use of the syntactic constructs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
classification = "723",
corpsource = "IBM System Products Div., Boeblingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algebraic specifications; axiomatic specifications;
computer programming languages; computer software; high
level languages; high-level specification; language
constructs; large software systems; pseudocode; SLAN-4;
syntactic constructs",
treatment = "P Practical",
}
@Article{Moler:1983:RSR,
author = "Cleve Moler and Donald Morrison",
title = "Replacing Square Roots by {Pythagorean} Sums",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "577--581",
month = nov,
year = "1983",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.276.0577",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/bibnet/authors/m/moler-cleve-b.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5390405;
http://www.research.ibm.com/journal/rd/276/ibmrd2706P.pdf",
abstract = "An algorithm is presented for computing a `Pythagorean
sum' $ a \osum b = \sqrt {a^2 + b^2} $ directly from
$a$ and $b$ without computing their squares or taking a
square root. No destructive floating point overflows or
underflows are possible. The algorithm can be extended
to compute the Euclidean norm of a vector. The
resulting subroutine is short, portable, robust, and
accurate, but not as efficient as some other
possibilities. The algorithm is particularly attractive
for computers where space and reliability are more
important than speed",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods); C5230 (Digital
arithmetic methods)",
classification = "723",
corpsource = "Dept. of Computer Sci., Univ. of New Mexico,
Albuquerque, NM, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computer metatheory --- Algorithmic
Languages; computer programming; digital arithmetic;
Euclidean norm; floating-point arithmetic; iterative
methods; performance; Pythagorean sums; subroutine;
vector",
review = "ACM CR 8406-0463",
subject = "G.1 Mathematics of Computing, NUMERICAL ANALYSIS,
Roots of Nonlinear Equations \\ F.2.1 Theory of
Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
COMPLEXITY, Numerical Algorithms and Problems,
Computations on polynomials \\ F.2.2 Theory of
Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
COMPLEXITY, Nonnumerical Algorithms and Problems,
Geometrical problems and computations",
treatment = "T Theoretical or Mathematical",
}
@Article{Dubrulle:1983:CNM,
author = "Augustin A. Dubrulle",
title = "Class of Numerical Methods for the Computation of
{Pythagorean} Sums",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "582--589",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/bibnet/authors/m/moler-cleve-b.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Moler and Morrison have described an iterative
algorithm for the computation of the Pythagorean sum
(a**2 plus b**2)** one-half of two real numbers a and
b. This algorithm is immune to unwarranted
floating-point overflows, has a cubic rate of
convergence, and is easily transportable. This paper,
which shows that the algorithm is essentially Halley's
method applied to the computation of square roots,
provides a generalization to any order of convergence.
Formulas of orders 2 through 9 are illustrated with
numerical examples. The generalization keeps the number
of floating-point divisions constant and should be
particularly useful for computation in high-precision
floating-point arithmetic.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods); C5230 (Digital
arithmetic methods)",
classification = "723; 921",
corpsource = "IBM Sci. Centre, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; digital arithmetic;
floating-point divisions; Halley's method;
high-precision floating-point arithmetic; iterative
algorithm; iterative methods; mathematical techniques
--- Numerical Methods; Pythagorean sums; rate of
convergence; square roots",
treatment = "T Theoretical or Mathematical",
}
@Article{Lee:1983:BSE,
author = "H. C. Lee and H. D. Conway",
title = "Bending and stretching an elastic strip around a
narrow cylindrical drum",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "590--597",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A4630C (Elasticity); A4630J (Viscoelasticity,
plasticity, viscoplasticity, creep, and stress
relaxation)",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "anticlastic deformation; bending; deflected forms;
elastic deformation; elastic strip; elasticity; narrow
cylindrical drum; stretching; strip width; tension",
treatment = "T Theoretical or Mathematical",
}
@Article{Houser:1983:ATW,
author = "D. E. Houser and K. J. Lubert",
title = "Automated Twisted-Pair Wire Bonding",
journal = j-IBM-JRD,
volume = "27",
number = "6",
pages = "598--606",
month = nov,
year = "1983",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A need for highly dense and reworkable external
interconnections with controlled characteristic
impedance on high-performance printed-circuit boards
led to the development of the process and equipment
described in this paper. These interconnections are
required to implement engineering changes, to install
precise circuit delays, to repair printed-circuit
defects, and to complete interconnections not possible
with printed circuitry alone. As an economical way to
meet the characteristic impedance requirement of 80
plus or minus 10 OMEGA and the density requirement for
terminations on a 2.5-mm `staggered' grid (twice as
dense as a 2.5-mm-square grid), 39-gauge twisted-pair
wire is used. A solder-reflow process bonds the wires
to the printed circuitry and meets the need for
reworkability. Computer-controlled equipment, developed
to install twisted-pair wires at production rates, is
now being used in several IBM plants worldwide.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B2210D
(Printed circuit manufacture); C3350Z (Control
applications in other industries); C7410D (Electronic
engineering computing); C7420 (Control engineering
computing)",
classification = "704; 714",
corpsource = "IBM General Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "39-gauge twisted-pair wire; boards; characteristic
impedance; computer controlled equipment; control;
controlled; electric connectors; electronic equipment
manufacture; high-performance printed-circuit; IBM
plants; manufacturing computer; printed circuits;
printed-circuit defects; reworkable external
interconnections; solder-reflow process; soldering;
twisted-pair wire bonding",
treatment = "P Practical",
}
@Article{Adams:1984:OPS,
author = "Edward N. Adams",
title = "Optimizing Preventive Service of Software Products",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "2--14",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is found that most of the benefit to be realized by
preventive service comes from removing a relatively
small number of high-rate defects that are found early
in the service life of the code. For the typical user
corrective service would seem preferable to preventive
service as a way of dealing with most defects found
after code has had some hundreds of months of usage.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6100 (Software techniques and systems)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "additional software; computer software; corrective
service; defects; design errors; fixes for defects;
hundreds of months of usage; modeling problem
occurrence; preventive service optimisation; problems;
process in execution time; program debugging; random;
small number of high-rate; software developer; software
engineering; software errors; software products;
software user",
treatment = "A Application; P Practical",
}
@Article{Hall:1984:CNC,
author = "N. R. Hall and S. Preiser",
title = "Combined Network Complexity Measures",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "15--27",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Paper describes techniques to measure the complexity
of large (greater than 100,000 source lines of code)
systems during the software architecture phase, before
major design decisions have been made. Methods
developed include (1) an extension of the
graph-theoretic measure developed by McCabe to software
architecture, as represented by networks of
communicating modules, (2) a general technique that
allows the complexity associated with allocation of
resources (CPU, tape, disk, etc.) to be measured, and
(3) a method that combines module complexity and
network complexity, so that design trade-offs can be
studied to determine whether it is advantageous to have
separate modules for service functions, such as
mathematical subroutines, data management routines,
etc.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6110
(Systems analysis and programming)",
classification = "723",
corpsource = "IBM Federal Systems Div., Bethesda, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "allocation of resources; before major design;
complexity measurement; complexity reduction;
computational complexity; computer architecture;
computer networks; computer software; consistent
results; data management routines; decisions; design
languages; design trade-offs; engineering;
graph-theoretic measure; mathematical; module
complexity; network complexity; networks of
communicating modules; number of source lines of code
>100000; programming theory; separate modules for
service functions; software; software architecture
phase; software complexity; source code; subroutines;
techniques",
treatment = "T Theoretical or Mathematical",
}
@Article{Sowa:1984:ILI,
author = "John F. Sowa",
title = "Interactive Language Implementation System",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "28--39",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Interactive Language Implementation System (ILIS)
is a tool for implementing language processors. It is
fast enough for conventional compilers and general
enough for processing natural languages. ILIS is built
around a language for writing grammars. Unlike most
compiler-compilers, the language includes a full range
of semantic operators that reduce or eliminate the need
for invoking other programming languages during a
translation. ILIS is also highly interactive: It has
facilities for tracing a parse and for adding or
deleting grammar rules dynamically. This paper
describes the features of ILIS and its use in several
different projects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C4240 (Programming and algorithm
theory); C6150C (Compilers, interpreters and other
processors)",
classification = "723",
corpsource = "IBM Systems Res. Inst., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compiler-compilers; compilers; computer programming
languages; deleting grammar rules dynamically;
engineering; features; full range of semantic
operators; grammars; highly; ILIS; interactive;
Interactive Language Implementation System; language
for writing grammars; parsers; processing natural
languages; program compilers; programming theory;
software; tool for implementing language processors",
treatment = "P Practical",
}
@Article{Ris:1984:EAF,
author = "Frederic N. Ris",
title = "Experience with Access Functions in an Experimental
Compiler",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "40--51",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an access function subsystem
embedded in portions of an experimental microcode
compiler which was built and used during 1973-6 using
the IBM PL/I optimizing compiler under VM\slash 370 and
CMS. The use of the access function subsystem in this
context was itself an experiment, performed by a group
for all of whom PL/I was a new language and VM\slash
370 a new operating system. The implementation of the
subsystem was done strictly within the confines of the
PI/I language. The basic objectives were ease of use,
provision of a focal point for global storage
management, extensive run-time validity checking with
appropriate diagnostics, and data protection. Beyond
satisfying these objectives, the subsystem proved more
valuable than anticipated due to positive contributions
made to debugging code in the VM\slash 370 interactive
development environment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "722; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access function subsystem; CMS; computer operating
systems; data protection; debugging code; diagnostics;
ease of; experience; experimental; extensive; focal
point for global storage management; IBM PL/I
optimizing compiler; implementation; microcode
compiler; objectives; operating system; PL/1; program
compilers; run-time validity checking; use; VM/370;
VM/370 interactive development environment",
treatment = "A Application; X Experimental",
}
@Article{Strom:1984:NPM,
author = "Robert Strom and Nagui Halim",
title = "New Programming Methodology for Long-Lived Software
Systems",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "52--59",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new software development methodology based on the
language NIL is presented. The methodology emphasizes
(1) the separation of program development into
functional specification and tuning phases, (2) the use
of a fully compilable and executable design, (3) an
interface definition and verification mechanism. This
approach reduces life-cycle costs and improves software
quality because (a) errors are detected earlier, and
(b) a single functional design can be re-used to
produce many implementations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6140D (High
level languages)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compatible design; computer programming languages;
computer software; errors are detected earlier;
executable design; functional; functional
specification; high level languages; interface
definition; language NIL; life-cycle costs; long-lived
software systems; phase; programming; single functional
design; software development methodology; software
engineering; software portability; software quality;
specification; tuning phase; verification mechanism",
treatment = "N New Development",
}
@Article{Alberga:1984:PDT,
author = "C. N. Alberga and A. L. Brown and G. B. {Leeman, Jr.}
and M. Mikelsons and M. N. Wegman",
title = "A program development tool",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "60--73",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes how authors have combined a
number of tools (most of which are tailored to a
particular programming language) into a single system
to aid in the reading, writing, and running of
programs. Discussed is the efficacy and the structure
of two such systems, one of which has been used to
build several large application programs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; efficacy; large application
programs; program development tool; programming;
programs; reading programs; running of; software
engineering; structured programming; writing programs",
treatment = "A Application; P Practical",
}
@Article{Kruskal:1984:MMP,
author = "Vincent Kruskal",
title = "Managing Multi-Version Programs with an Editor",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "74--81",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "When more than one version of a program must be
maintained, generally much of the code is repeated
unchanged in many versions. Techniques such as `deltas'
and conditional compilation are commonly used to avoid
duplicating these common parts. In addition to saving
storage, these methods aid the programmer greatly in
managing updates to the versions. Unfortunately, these
representations of multi-version programs can appear
very unlike a program, making them difficult to edit.
Described here is a new method of automating much of
the bookkeeping involved in dealing with multi-version
programs. It entails use of a special editor that
enables a multi-version program to be seen and modified
in a fashion that is far closer to that normally
permitted for a single-version program.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming); C6120 (File
organisation); C6150C (Compilers, interpreters and
other processors)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bookkeeping; computer programming; conditional
compilation; data structures; deltas; editor; managing
updates; multi-version; multiversion programs
management; program processors; programs; special
editor",
treatment = "N New Development",
}
@Article{Casanova:1984:MUS,
author = "Marco A. Casanova and Jose E. {Amaral de Sa}",
title = "Mapping Uninterpreted Schemes into Entity-Relationship
Diagrams: Two Applications to Conceptual Schema
Design",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "82--94",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method of mapping sets of uninterpreted record or
relation schemes into entity-relationship diagrams is
described and then applied to two conceptual design
problems. First, the method is applied to the design of
relational databases. It is shown that the method can
be interpreted as a normalization procedure that maps a
given relational schema into a new schema that
represents an entity-relationship diagram. That is, the
original schema has an interpretation in terms of
higher-order concepts, which helps in understanding the
semantics of the database it describes. The second
design problem is related to the conversion of
conventional file systems to the database approach.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6160D (Relational databases)",
classification = "723",
corpsource = "IBM Brazil Sci. Center, Brasilia, Brazil",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "conceptual design problems; conceptual schema design;
database conceptual schema; database management
systems; database semantics; database systems; DBMS;
design; entity-relationship diagrams; file to database
conversion; higher-; normalization procedure; of
relational databases; order concepts; uninterpreted
schemes mapping",
treatment = "T Theoretical or Mathematical",
}
@Article{Goyal:1984:PAF,
author = "A. Goyal and T. Agerwala",
title = "Performance Analysis of Future Shared Storage
Systems",
journal = j-IBM-JRD,
volume = "28",
number = "1",
pages = "95--108 (or 95--107??)",
month = jan,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with the analysis and design of two
important classes of computer systems; BIP (Billion
Instructions Per Second) systems consisting of a few
very high performance processors and KMIP (K Million
Instructions Per Second) systems with hundreds of low
speed processors. Each system has large, shared
semiconductor memories. Simple analytic models are
developed for estimating the performance of such
systems. The models are validated using simulation.
They can be utilized to quickly reduce the design space
and study various trade-offs. The models are applied to
BIP and KMIP systems and their use is illustrated using
examples.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5320G (Semiconductor
storage)C5420 (Mainframes and minicomputers)",
classification = "714; 721; 722; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytical models; billion instructions per; BIP; BIP
systems; classes of computer systems; computer
architecture; computer systems, digital; data storage,
semiconductor --- Performance; design space; design
tradeoffs; distributed processing; few very high
performance; hundreds of low speed processors; K
million instruction per second systems; KMIP; KMIP
systems; parallel; performance analysis; processing;
processors; second systems; semiconductor memories;
semiconductor storage; shared; shared storage systems;
simulation; supercomputers; validated using",
treatment = "T Theoretical or Mathematical",
}
@Article{Chen:1984:ECS,
author = "C. L. Chen and M. Y. Hsiao",
title = "Error-Correcting Codes for Semiconductor Memory
Applications: a State-Of-The-Art Review",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "124--134",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a state-of-the-art review of
error-correcting codes for computer semiconductor
memory applications. The construction of four classes
of error-correcting codes appropriate for semiconductor
memory designs is described, and for each class of
codes the number of check bits required for commonly
used data lengths is provided. The implementation
aspects of error correction and error detection are
also discussed, and certain algorithms useful in
extending the error-correcting capability for the
correction of soft errors such as alpha
-particle-induced errors are examined in some detail.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B6120B (Codes); C5320G
(Semiconductor storage)",
classification = "714; 723",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alpha -particle-induced errors; check bits; codes,
symbolic; computer; data lengths; data storage,
semiconductor; error correction codes; error-correcting
codes; reviews; semiconductor memory; semiconductor
storage; soft errors; state-of-the-art review",
treatment = "A Application; P Practical",
}
@Article{Langdon:1984:IAC,
author = "Glen G. {Langdon, Jr.}",
title = "An introduction to arithmetic coding",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "135--149",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A29",
MRnumber = "85h:94016a",
bibdate = "Sat Feb 24 09:36:01 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See comment \cite{Langdon:1984:EIA}.",
abstract = "Arithmetic coding is a data compression technique that
encodes data (the data string) by creating a code
string which represents a fractional value on the
number line between 0 and 1. Arithmetic coding differs
considerably from the more familiar compression coding
techniques, such as prefix (Huffman) codes. This paper
presents the key notions of arithmetic compression
coding by means of simple examples.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130 (Data handling techniques)",
classification = "723",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arithmetic coding; code string; codes, symbolic;
coding algorithm; data compression; data compression
technique; data processing --- Data Compression; data
string; encoding; intervals; magnitude comparisons;
nested; symbolwise recursive",
treatment = "P Practical",
}
@Article{Blahut:1984:URD,
author = "Richard E. Blahut",
title = "A universal {Reed--Solomon} decoder",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "150--158",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Two architectures for universal Reed--Solomon decoders
are given. These decoders, called time-domain decoders,
work directly on the raw data word as received without
the usual syndrome calculation or power-sum-symmetric
functions. Up to the limitations of the working
registers, the decoders can decode any Reed--Solomon
codeword or BCH codeword in the presence of both errors
and erasures. Provision is also made for decoding
extended codes and shortened codes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes)",
classification = "723",
corpsource = "IBM Federal Syst. Div., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "BCH codeword; codes; codes, symbolic; decoding;
extended codes; shortened; time-domain decoders;
universal Reed--Solomon decoders; working registers",
treatment = "T Theoretical or Mathematical",
}
@Article{Blahut:1984:URS,
author = "Richard E. Blahut",
title = "A universal {Reed--Solomon} decoder",
journal = j-IBM-JRD,
volume = "28",
number = "??",
pages = "150--158",
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
ZMnumber = "538.94015",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ariat:1984:IEA,
author = "J. Ariat and W. C. Carter",
title = "Implementation and evaluation of a $(b,k)$-adjacent
error-correcting\slash detecting scheme for
superconductor systems",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "159--169",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a coding scheme developed for a
specific supercomputer architecture and structure. The
code considered is a shortened (b,k)-adjacent
single-error-correcting double-error
probabilistic-detecting code with b equals 5, k equals
1, and code group width equals 4. An evaluation of the
probabilistic double-error-detection capability of the
code was performed for different organizations
encompassing the traditional feature of memory data
error protection and also providing for the detection
of major addressing errors that may result from faults
affecting the interconnection network communication
modules. The cost of implementation is a limited amount
of extra hardware and a negligible degradation in the
double-error-detection properties of the code.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5440 (Multiprocessing
systems); C6130 (Data handling techniques)",
classification = "723",
corpsource = "Lab. for Autom. and Syst. Anal., Nat. Center for Sci.
Res., Toulouse, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(b,k)-adjacent error-correcting/detecting scheme;
addressing errors; code; code group width; codes,
symbolic; coding/decoding strategies; communications
modules; computer architecture; detection codes;
double-error probabilistic-detecting; error; error
correction codes; interconnection network;
organization; parallel processing; superconductor
systems; system",
treatment = "P Practical",
xxauthor = "J. Arlat and W. C. Carter",
}
@Article{Bossen:1984:FAE,
author = "D. C. Bossen and C. L. Chen and M. Y. Hsiao",
title = "Fault Alignment Exclusion for Memory Using Address
Permutation",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "170--176",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A significant improvement in memory fault tolerance,
beyond what is already provided by the use of an
appropriate error-correcting code (ECC), can be
achieved by electronic chip swapping, without any
compromise of data integrity as large numbers of faults
are allowed to accumulate. Since most large and
medium-sized semiconductor memories are organized so
that each bit position of the system word (ECC
codeword) is fed from a different chip, and quite often
from a different array card, or at least from distinct
partitions of an array card, the various bit positions
have separate address circuitry on the array cards.
This fact is important, and can be exploited to provide
effective address permutation capability, which allows
the realignment of faults which would otherwise have
caused an uncorrectable multiple error in an ECC
codeword.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); C5320G (Semiconductor
storage); C6120 (File organisation)",
classification = "714; 723",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "address permutation; capability; chip swapping; codes,
symbolic --- Error Correction; computer systems,
digital; data storage, semiconductor; electronic; error
correction codes; error-correcting code; EX-OR
circuitry; fault map; fault tolerant computing; memory
fault tolerance; redundancy; semiconductor memories;
semiconductor storage; storage latches; storage
management",
treatment = "P Practical",
}
@Article{Aichelmann:1984:FDT,
author = "F. J. {Aichelmann, Jr.}",
title = "Fault-Tolerant Design Techniques for Semiconductor
Memory Applications",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "177--183",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In this paper, a number of design approaches are
presented for minimizing the effects of chip failures
through the use of organizational techniques and
through enhancements to conventional error checking and
correction facilities. The fault-tolerant design
techniques described are compatible with most existing
memory designs. An evaluative comparison of these
techniques is included, and their application and
utility are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); C5320G (Semiconductor
storage)",
classification = "714; 721; 723",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "codes, symbolic --- Error Correction; computer
systems, digital; correction facilities; data storage,
semiconductor; error checking; error correction; error
detection; fault tolerant computing; fault-tolerant
design; memory; memory chips; multiple-bit-per-chip
organization; reliability; semiconductor memory;
semiconductor storage; system",
treatment = "P Practical",
}
@Article{Chen:1984:FMS,
author = "C. L. Chen and R. A. Rutledge",
title = "{Fault-tolerant Memory Simulator}",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "184--195",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the Fault-Tolerant Memory
Simulator (FTMS), an interactive APL program which uses
Monte Carlo simulation to evaluate the reliability of
fault-tolerant memory systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140G (Monte Carlo methods); C5310 (Storage system
design); C7430 (Computer engineering)",
classification = "714; 721; 723",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL program; computer systems, digital; computing;
data storage, semiconductor; digital simulation;
digital storage; failure rate; fault tolerance; fault
tolerant; Fault-Tolerant Memory Simulator; interactive;
memory systems; Monte Carlo methods; Monte Carlo
simulation; reliability; system",
treatment = "P Practical",
}
@Article{Libson:1984:GMR,
author = "M. R. Libson and H. E. Harvey",
title = "A general-purpose memory reliability simulator",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "196--205",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a Monte Carlo simulator which can
predict uncorrectable error rates and
field-replaceable-unit replacement rates for a wide
range of memory architectures and under a variety of
maintenance strategies. The model provides valuable
information for performing sensitivity studies of
intrinsic failure rates for memory components, for
performing tradeoff studies of alternative storage
module and card organizations, for evaluating system
functions, and for establishing optimum maintenance
strategies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140G (Monte Carlo methods); C5310 (Storage system
design); C7430 (Computer engineering)",
classification = "714; 721; 723; 922",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer; data storage, semiconductor; digital
simulation; digital storage; error correction; failure
rates; field service frequency; general-purpose memory
reliability simulator; maintenance strategies;
mathematical statistics --- Monte Carlo Methods;
memory; methods; modules; Monte Carlo; optimal
maintenance strategies; simulator; storage management;
uncorrectable error",
treatment = "P Practical",
}
@Article{Howell:1984:ACE,
author = "Thomas D. Howell",
title = "Analysis of Correctable Errors in the {IBM 3380} Disk
File",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "206--211",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method of analyzing the correctable errors in disk
files is presented. It allows one to infer the most
probable error in the encoded-data stream given only
the unencoded readback and error-correction
information. This method is applied to the errors
observed in seven months of operation of four IBM 3380
head-disk assemblies. It is shown that nearly all the
observed errors can be explained as single-bit errors
at the input to the channel decoder. About 90 percent
of the errors were related to imperfections in the disk
surfaces. The remaining 10 percent were mostly due to
heads which were unusually susceptible to random
noise-induced errors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
classification = "723",
corpsource = "IBM Res. Div., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "codes, symbolic; correctable errors; disk surfaces;
error analysis; errors; IBM 3380 disk file; magnetic
disc storage; most probable error; random
noise-induced; single-bit errors; storage management",
treatment = "P Practical",
}
@Article{Tang:1984:IEP,
author = "D. T. Tang and C. L. Chen",
title = "Iterative Exhaustive Pattern Generation for Logic
Testing",
journal = j-IBM-JRD,
volume = "28",
number = "2",
pages = "212--219",
month = mar,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Exhaustive pattern logic testing schemes provide all
possible input patterns with respect to an output in
the set of test patterns. This paper is concerned with
the problem that arises when this is to be done
simultaneously with respect to a number of outputs,
using a single test set. More specifically, this paper
describes an iterative procedure for generating a test
set consisting of n-dimensional vectors which
exhaustively covers all k-subspaces simultaneously,
i.e., the projections of n-dimensional vectors in the
test set onto any input subset of a specified size k
contain all possible patterns of k-tuples.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); C5210 (Logic design
methods)",
classification = "721",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "exhaustive pattern generation; iterative; iterative
methods; k-subspaces; logic circuits; logic testing;
n-dimensional vectors; nonbinary cases; procedure; test
set; vectors",
treatment = "T Theoretical or Mathematical",
}
@Article{Myers:1984:ITI,
author = "R. A. Myers and J. C. Tamulis",
title = "Introduction to Topical Issue on Non-Impact Printing
Technologies",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "234--240",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper, presents an overview of the technologies
of importance in computer output printing, providing a
background for the succeeding papers in this issue. IBM
workers have played a key role in the evolution of
computer printers from a few marginally reliable
complex mechanisms to an industry which today counts
annual sales of over ten billion dollars worldwide.
Thus, in this necessarily brief description of the
different technologies we mention those in which the
IBM role was particularly noteworthy, with specific
mention of machines which brought the technologies to
the marketplace.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "722; 745",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; non-impact printing;
printing",
}
@Article{Lee:1984:TTE,
author = "M. H. Lee and J. E. Ayala and B. D. Grant and W.
Imaino and A. Jaffe and M. R. Latta and S. L. Rice",
title = "Technology Trends in Electrophotography",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "241--251",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Selected innovations and advances in
electrophotographic printing are reviewed.
Technological advances in photoreceptors, imaging
techniques, toner development and cleaning, fusing,
sensors, and new machine configurations and functions
are discussed with respect to their possible
applicability to future electrophotographic imaging
systems. In general, improvements in print quality and
reliability remain the main goals. In specific
applications, added functions and an increased range of
usable media are highly desired.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices); C5550 (Printers,
plotters and other hard-copy output devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cleaning; computer peripheral equipment --- Printers;
electrophotographic printing; electrophotography;
fusing; imaging techniques; photography;
photoreceptors; print quality; printers; printing;
reliability; sensors; toner development",
treatment = "A Application; G General Review; P Practical",
}
@Article{Miller:1984:IIP,
author = "R. C. {Miller, Jr.}",
title = "Introduction to the {IBM 3800} Printing Subsystem
Models 3 and 8",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "252--256",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The IBM 3800 Printing Subsystem Models 3 and 8 are
high-speed, non-impact, electrophotographic printers
which are designed for system printing, text, and
graphics applications requiring flexibility and high
print quality. Features such as their print density of
240 multiplied by 240 pels\slash in**2 and all-point
addressability extend substantially their printing
capabilities beyond those of the Models 1 and 2.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "all-point addressability; computer peripheral
equipment; electrophotographic printers;
electrophotography; flexibility; graphics; IBM 3800;
IBM 3800 printing subsystem; print density; print
quality; printers; printing subsystems; system
printing; text",
treatment = "N New Development; P Practical",
}
@Article{McMurtry:1984:TIP,
author = "David McMurtry and Mike Tinghitella and Roger
Svendsen",
title = "Technology of the {IBM 3800} Printing Subsystem Model
3",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "257--262",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "IBM has introduced the 3800 Model 3
electrophotographic printer, which is a modified
version of the previously developed Model 1. The Model
3 improves the print density of the 3800 Model 1 from
180 multiplied by 144 pels\slash in. **2 to 240
multiplied by 240 pels\slash in. **2 and permits each
pel to be addressed individually. The laser print head
was modified to create the higher density by using the
same laser, focusing to a smaller spot size, slowing
down the speed of the rotating mirror, and developing a
dual-beam system. Beam-power balance and beam
separation were selected for optimum print quality. The
dual-beam print head required the development of a new
photoconductor with improved sensitivity. That
photoconductor also displayed a significantly increased
lifetime. Improved manufacturing techniques were
developed to reduce photoconductor defects. A digital
voltmeter and a new processor were introduced that
reduced the cost of the process servos by eliminating
previously hard-wired elements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; density; digital
voltmeter; dual-beam; electrophotography; IBM 3800;
laser print head; laser printers; Model 3
electrophotographic printer; photoconductor; print;
print quality; printing subsystem model three; rotating
mirror; system",
treatment = "N New Development; P Practical",
}
@Article{Barrera:1984:EPC,
author = "C. Barrera and A. V. Strietzel",
title = "Electrophotographic Printer Control as Embodied in the
{IBM 3800} Printing Subsystem Models 3 and 8",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "263--275",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Control of the IBM 3800 Models 3 and 8
electrophotographic printers is achieved by use of a
fundamentally different control system than was used in
their predecessors, the Models 1 and 2. As a result,
printing of composed pages or electronic overlays can
include text of many different font sizes and styles
printed in multiple orientations, as well as raster
images up to a full page in size. The printers manage
stored resources, including fonts, segments of pages,
and electronic overlays. Pages are composed inside the
printers in a logical sequence, instead of by the more
traditional line-by-line sequence. This, as well as the
capability to position text and images at any
addressable point, enhances usability. A high-speed,
table-driven character generator, a new command set,
and a microcoded control unit make all of this
possible.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "command; composed pages; computer peripheral
equipment; control system; electronic overlays;
electrophotographic printers; electrophotography; font
sizes; IBM 3800; images; microcoded control unit;
photography; printers; printing --- Control Systems;
raster; set; table-driven character generator;
usability",
treatment = "N New Development; P Practical",
}
@Article{Crawford:1984:PQM,
author = "J. L. Crawford and C. D. Elzinga and R. Yudico",
title = "Print Quality Measurements for High-Speed
Electrophotographic Printers",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "276--284",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Described here are some of the characteristics that
make electrophotographic printing esthetically
pleasing, and the use of a recently developed
computer-controlled scanner for measuring those
characteristics. New print quality measurements are
described (for example, measurements of modulation,
image gray-scale fidelity, and tangential-edge
roughness) that allow the monitoring of the advanced
printing functions made possible by all-point
addressability. The requirements for the implementation
of the scanner are discussed. Also discussed are the
effects and limitations on print quality measurement
resolution imposed by the algorithms used and the
scanner; the effect of light scatter by the paper; and
the usefulness of the print quality measurements as an
aid in making design trade-off decisions and in
manufacturing control.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "all-point addressability; computer peripheral
equipment; computer-controlled; electrophotography;
functions; high-speed electrophotographic printers;
image gray-; light scatter; measurement resolution;
modulation; photography; print quality measurements;
printers; printing; scale fidelity; scanner;
tangential-edge roughness",
treatment = "P Practical; X Experimental",
}
@Article{Borch:1984:PMC,
author = "J. Borch and R. G. Svendsen",
title = "Paper Material Considerations for System Printers",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "285--291",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Laser printing of continuous forms by means of
electrophotographic imaging requires that the paper on
which the printing is carried out show good handling
characteristics at fast machine speeds and be
compatible with toner transfer and fixing. Toner
transfer requires suitable electrical paper
characteristics, similar to those of xerographic cut
sheets intended for use in electrophotographic
cut-sheet copiers and printers. Hot-pressure fusing in
the IBM 3800 printing subsystem has been shown to
require adequate paper-fiber wettability by the hot
molten toner. Therefore, characteristics of paper
chemistry, and in particular paper sizing, are
essential in creating good image fixing (fusing). In
addition, the temperature and pressure in the fusing
assembly affect the thermal and dimensional stability
of the paper. For the 3800, this necessitated
modifications in roll design within the fusing station
in order to ensure satisfactory paper handling.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; electrophotographic
imaging; electrophotography; fixing; fusing station;
handling characteristics; hot-pressure fusing; IBM
3800; laser printers; laser printing; paper ---
Printing Properties; paper chemistry; paper handling;
paper sizing; printing; roll design; system printers;
toner; transfer",
treatment = "P Practical",
}
@Article{Baumann:1984:FFE,
author = "Gerald W. Baumann",
title = "Flash Fusing in Electrophotographic Machines",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "292--299",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A theoretical model of the flash fusing process for
electrophotographic machines was developed using the
joint solution of a nonlinear circuit equation and the
one-dimensional thermal diffusion equation. Numerous
experiments were run using different toners according
to the size of toner particles and the pulse width in
order to determine the minimum energy that was required
for fusing. The experiments confirm that this model
predicts reasonably well what was observed in the lab.
The melt depth required for good fusing is slightly
less than mean particle size. At that depth the
temperature is somewhat greater than the temperature
required in the nip of a hot roll fuser for the same
toner. Under typical flash fusing, the top surface of
the toner is subjected to considerably higher
temperatures than the melt temperature of the toner.
From the combined analytical and experimental results,
the proper compromises can be made for efficiency and
volatiles.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B5180D (Electrostatic devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; electrophotographic
machines; electrophotography; flash; flash fusing;
fusing process; melt depth; nonlinear circuit equation;
one-dimensional; printing; pulse width; theoretical
model; thermal diffusion equation; toners",
treatment = "X Experimental",
}
@Article{Darling:1984:MIJ,
author = "Richard H. Darling and Chen-Hsiung Lee and Lawrence
Kuhn",
title = "Multiple-Nozzle Ink Jet Printing Experiment",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "300--306",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An experimental printer is described which utilizes a
densely packed array of ink jets operated in a binary,
pressurized, asynchronous mode. The printer
configuration, the ink jet head structure, the
operating point, and the maintenance approach are all
discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745; 804",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "asynchronous mode; computer peripheral equipment ---
Printers; densely packed array; head structure; ink;
ink jet printers; ink jet printing; ink jets; operating
point; printer; printing",
treatment = "X Experimental",
}
@Article{Lee:1984:ADI,
author = "F. C. Lee and R. N. Mills and F. E. Talke",
title = "Application of Drop-On-Demand Ink Jet Technology to
Color Printing",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "307--313",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The application of drop-on-demand ink jet technology
to high-frequency and high-resolution color printing is
investigated using an experimental multi-nozzle print
head. Cross talk and drop misregistration are examined
as a function of drop ejection frequency. Typical print
samples from scanned and computer-generated data are
obtained and the dependence of print quality on various
parameters such as drop ejection frequency, ink
composition, and paper quality is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "color; computer peripheral equipment --- Printers;
computer-generated data; crosstalk; drop; drop
misregistration; drop-on-demand ink jet technology;
ejection frequency; ink composition; ink jet printers;
ink jet printing; multinozzle print head; paper
quality; print quality; printing",
treatment = "N New Development; P Practical",
}
@Article{Bogy:1984:ETS,
author = "D. B. Bogy and F. E. Talke",
title = "Experimental and Theoretical Study of Wave Propagation
Phenomena in Drop-On-Demand Ink Jet Devices",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "314--321",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents experimental observations and a
theoretical analysis of the operation of drop-on-demand
piezoelectric ink jet devices. By studying
experimentally the dependence of several operating
characteristics on the length of the cavity in the
nozzle of an ink jet device, we have gained insight
into the physical phenomena underlying the operation of
such a device. It is concluded that drop-on-demand ink
jet phenomena are related to the propagation and
reflection of acoustic waves within the ink jet cavity.
A simple analysis is carried out on the basis of linear
acoustics which is in good agreement with the
experimental observations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "714; 745; 751; 804",
corpsource = "IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acoustic wave propagation; acoustic waves; acoustic
waves --- Propagation; cavity; drop ejection;
drop-on-demand ink jet devices; ink; ink jet devices;
ink jet printers; linear acoustics; operating
characteristics; piezoelectric devices; piezoelectric
ink jet; printing; wave propagation",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Fromm:1984:NCF,
author = "J. E. Fromm",
title = "Numerical Calculation of the Fluid Dynamics of
Drop-On-Demand Jets",
journal = j-IBM-JRD,
volume = "28",
number = "3",
pages = "322--333",
month = may,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A numerical method that makes use of the complete
incompressible flow equations with a free surface is
discussed and used to study an impulsively driven
laminar jet. Flow behavior dependence upon fluid
properties (characterized by a Reynolds number over
Weber number nondimensionalization) is compared for
drop integrity purposes. Several variations of square
wave pressure history applied at a nozzle inlet are
discussed in relation to drop velocities produced and
structure of ejected drops. Timewise development of
flow both interior and exterior to the nozzle is
illustrated through computed contour sequences.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "632; 745; 804",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "fluidics; ink; ink jets; printing",
}
@Article{Tryon:1984:SFA,
author = "D. R. Tryon and F. M. Armstrong and M. R. Reiter",
title = "Statistical Failure Analysis of System Timing",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "340--355",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Techniques are developed that quantify the probability
that large computer systems will meet their cycle time
objectives. Both approximation techniques and rigorous
multivariate statistical techniques are described. A
method is developed that enumerates the cycle-limiting
paths so that these approaches can be utilized. The
results of these techniques enable system designers to
ensure that performance and reliability objectives are
met.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140Z (Other topics in statistics); C5420 (Mainframes
and minicomputers); C5470 (Performance evaluation and
testing)",
classification = "722; 723; 922",
corpsource = "Div. of Data Syst., IBM, Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approximation techniques; computer systems, digital;
cycle time; cycle-limiting paths; failure analysis;
large computer systems; mainframes; multivariate;
performance evaluation; reliability; statistical
analysis; statistical failure analysis; statistical
methods; statistical techniques; system timing",
treatment = "T Theoretical or Mathematical",
}
@Article{Flynn:1984:MIE,
author = "Michael J. Flynn and Lee W. Hoevel",
title = "Measures of Ideal Execution Architectures",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "356--369",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is a study in ideal computer architectures
or program representations. We define measures of
`ideal' architectures that are related to the
higher-level representation used to describe a program
at the source language level. Canonic interpretive (CI)
measures are developed. CI measures apply to both the
space needed to represent a program and the time needed
to interpret it. Example-based CI measures are
evaluated for a variety of contemporary architectures,
both host-and language-oriented, as well as CI-derived
language-oriented architecture.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5470 (Performance
evaluation and testing); C6140D (High level
languages)",
classification = "722; 723",
corpsource = "Dept. of Electr. Eng., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "architectures; behavior; canonic interpretive
measures; computer architecture; computer
architectures; evaluation; execution architectures;
high level languages; ideal execution;
language-oriented architecture; performance; program;
representations; source language level; statistical",
treatment = "P Practical",
}
@Article{Correale:1984:DCS,
author = "A. Correale",
title = "Design Considerations of a Static {LSSD} Polarity Hold
Latch Pair",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "370--378",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Oct 25 10:36:51 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "There are many considerations relating to the design
of a static LSSD polarity hold latch pair. High
performance, low power dissipation, small size, and
stability are some of the major requirements for a good
design. The engineering trade-offs needed to ensure
that all goals are met are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5120 (Logic and switching
circuits)",
classification = "721",
corpsource = "Div. of Commun. Products, IBM, Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "flip-flops; level sensitive scan design; logic
circuits; logic design; LSSD polarity hold latch pair;
power dissipation; sequential circuits; stability;
static; static LSSD polarity hold latch pair",
treatment = "P Practical",
}
@Article{Matick:1984:APA,
author = "Richard Matick and Daniel T. Ling and Satish Gupta and
Frederick Dill",
title = "All Points Addressable Raster Display Memory",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "379--392",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses display designs which store the
image point by point in random access memory, so that
independent update of every pixel is possible. A
frequent bottleneck in the design of high performance
displays of this type is the available bandwidth of the
memory subsystem. In this paper, we focus on this issue
and present features of a customized dynamic RAM chip
which can readily provide the necessary bandwidth and
thus greatly simplify the design of very high
performance APA raster scan displays. The customized
RAM chip is quasi-two-ported. After briefly introducing
APA raster displays, we discuss display memory system
design and the design of the proposed custom memory
chip. We describe the second port for the video
refresh, which makes the primary port available for
update almost continuously.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2360 (Electron beam scanned
tubes)B7260 (Display technology and systems)",
classification = "721; 722; 723",
corpsource = "Div. of Res., IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "all points addressable raster display memory; APA;
cathode-ray tube displays; data storage, digital;
display devices; display instrumentation; display
memory; dynamic RAM chip; high; integrated memory
circuits; performance; performance displays; primary
port; random access memory; random-access storage;
raster display memory; system design; update; video
refresh",
treatment = "A Application; N New Development; P Practical",
}
@Article{Ostapko:1984:MMC,
author = "D. L. Ostapko",
title = "Mapping and Memory Chip Hardware Which Provides
Symmetric Reading\slash Writing of Horizontal and
Vertical Lines",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "393--398",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a mapping and memory chip
hardware for enhancing the performance of an APA
display. The approach describes a modification to the
primary port of a quasi-two-ported memory. This
modification allows several contiguous horizontal or
vertical bits to be read or written in one cycle. The
number of bits that can be stored is given by the
number of memory chips. The hardware modifications can
be on or off chip, and if on chip, the chip can still
be used as a conventional memory chip. Simple
modifications to the hardware will support different
screen sizes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2360 (Electron beam scanned
tubes)B7260 (Display technology and systems)",
classification = "721; 722; 723",
corpsource = "Div. of Res., IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APA display; cathode-ray tube displays; chip hardware;
data storage, digital; display devices; display
instrumentation; integrated memory circuits; mapping;
mapping and memory chip hardware; memory; memory chip;
primary port; quasi-two-ported; random-access storage;
semiconductor storage; symmetric reading/writing;
symmetric reading/writing of horizontal and vertical
lines; vertical lines",
treatment = "N New Development; P Practical",
}
@Article{Dave:1984:RRN,
author = "J. V. Dave and Jeno Gazdag",
title = "Reduction of Random Noise from Multiband Image Data
Using Phase Relationships Among Their {Fourier}
Coefficients",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "399--411",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is shown that, in general, the addition of random
noise results in the rapid change, with frequency, of a
quantity called the coherency measure. (This is a
quantitative measure of the phase agreement among the
phases of various Fourier coefficients at a given
frequency). The coherency measure vs. frequency curve
for a given data line is then used to attenuate various
Fourier coefficients of the corresponding nearby bands
of that line. It is then shown that the inverse
transformation of such modified Fourier coefficients
results in a statistically significant reduction of
noise from the data of single lines, or from those data
of some finite areas of the image. Results of a
supervised boxcar multispectral classification with the
original as well as various modified data sets of the
selected image are also presented to provide additional
guidance in use of such a sophisticated analytic
procedure in image processing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723; 921; 922",
corpsource = "Acad. Inf. Syst., IBM, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boxcar multispectral; classification; coherency
measure; data; Fourier analysis; Fourier coefficients;
frequency domain; image processing; multiband image
data; noise, spurious signal; phase relationships;
picture processing; pixel value; random noise; sets;
spatial domain; statistically significant; terrestrial
scene",
treatment = "T Theoretical or Mathematical",
}
@Article{Orth:1984:EAE,
author = "D. L. Orth",
title = "Empty Arrays in Extended {APL}",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "412--427",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "547.68010",
abstract = "During the past several years considerable work has
been done on extending APL in three areas: operators,
heterogeneous data, and nested data. In each area a
proposed extension must treat empty arrays
consistently. In this paper various possibilities for
providing consistent behavior are presented. The new
proposals possess at least one of two important
qualities in which older proposals tend to be
deficient: consistent behavior is independent of the
structural properties of rank and nesting, and the user
has control over the behavior when he wants it.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
classification = "723",
corpsource = "Div. of Res., IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL; apl language; computer programming languages;
empty arrays; extended APL; heterogeneous data; nested
data; operators; parallel processing; rank",
treatment = "P Practical",
}
@Article{Ohba:1984:SRA,
author = "Mitsuru Ohba",
title = "Software Reliability Analysis Models",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "428--443",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses improvements to conventional
software reliability analysis models by making the
assumptions on which they are based more realistic. In
an actual project environment, sometimes no more
information is available than reliability data obtained
from a test report. The models described here are
designed to resolve the problems caused by this
constraint on the availability of reliability data. By
utilizing the technical knowledge abut a program, a
test, and test data, we can select an appropriate
software reliability analysis model for accurate
quality assessment. The delayed S-shaped growth model,
the inflection S-shaped model, and the hyperexponential
model are proposed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming)",
classification = "723; 922",
corpsource = "Sci. Inst., IBM Japan Ltd., Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer software; delayed S-shaped growth;
environment; hyperexponential model; inflection
S-shaped model; model; project; quality assessment;
reliability analysis models; software reliability",
treatment = "P Practical",
}
@Article{Hopner:1984:DDE,
author = "E. Hopner and M. A. Patten",
title = "Digital Data Exchange --- a Space-Division Switching
System",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "444--453",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The user requirements for an automated switch for
computer terminals in a large establishment or
laboratory environment are discussed. This is followed
by an explanation of the design requirements, and
finally by a description of the significant features of
the digital data exchange (DDEX), a
microprocessor-controlled user-transparent
space-division digital data switch of modular design
which is capable of connecting 512 to 2048 lines from
various types of IBM terminals to different control
units, thereby substantially saving interconnection
resources.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6230Y (Other
switching centres); C3370G (Control applications in
data transmission); C5620 (Computer networks and
techniques); C7420 (Control engineering computing)",
classification = "722; 723",
corpsource = "IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated switch; computer networks; computer
terminals; computers --- Data Communication Equipment;
control units; data communication systems; DDEX;
digital data exchange; digital data switch; electronic;
IBM terminals; microprocessor-controlled
user-transparent space-division; requirements;
space-division switching system; switching systems;
user",
treatment = "A Application; N New Development; P Practical",
}
@Article{Gillespie:1984:RPC,
author = "Sherry J. Gillespie",
title = "Resist Profile Control in {E-Beam} Lithography",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "454--460",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Imaging studies have confirmed that a desired resist
profile can be obtained by selecting the appropriate
combination of process parameters: dose, interrupted
development, pattern bias, and resist thickness. Bias
sensitivity of the resist image to process parameters
was measured using a positive diazo resist with
nonlinear development characteristics on an IBM EL-3
E-beam tool. Because of superior bias stability,
top-edge imaging with undercut profiles in a
single-layer resist was found to provide many of the
imaging advantages of a multilayer system. Sufficient
resolution and image quality are obtained to extend the
application of a single-layer resist system to 1-$\mu$m
lithography.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2550G
(Lithography)",
classification = "711; 713; 745",
corpsource = "Div. of Gen. Technol., IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "dose; E-beam lithography; e-beam lithography; edge
imaging; electron beams; electron resists; IBM EL-3
E-beam tool; image quality; integrated circuit
manufacture; interrupted development; lithography ---
Applications; pattern bias; positive diazo resist;
process parameters; resist; resist profile; resist
profile control; resist system; semiconductor
technology; single-layer; thickness; top-; undercut
profiles",
treatment = "P Practical",
}
@Article{Stapper:1984:MDI,
author = "C. H. Stapper",
title = "Modeling of Defects in Integrated Circuit
Photolithographic Patterns",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "461--475 (or 461--474??)",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a previous paper by the same author the foundation
was laid for the theory of photolithographic defects in
integrated circuits. This paper expands on the earlier
one and shows how to calculate the critical areas and
probability of failure for dense arrays of wiring. The
results are used to determine the nature of the defect
size distribution with electronic defect monitors.
Several statistical techniques for doing this are
described and examples are given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240Z (Other topics in statistics); B2220C (General
integrated circuit fabrication techniques)",
classification = "713; 745; 922",
corpsource = "Div. of Gen. Technol., IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "areas; critical; defect modeling; defect size; dense
arrays; distribution; electronic defect monitors;
failure; failure analysis; integrated circuit
manufacture; integrated circuit photolithographic
patterns; integrated circuit technology; lithography
--- Applications; photolithography; statistical;
techniques; wiring",
treatment = "T Theoretical or Mathematical",
}
@Article{Held:1984:ATS,
author = "M. Held and A. J. Hoffman and E. L. Johnson and P.
Wolfe",
title = "Aspects of the Traveling Salesman Problem",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "476--486",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B10",
MRnumber = "85h:90046",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "558.90067",
abstract = "For fifty years the traveling salesman problem has
fascinated mathematicians, computer scientists, and
laymen. It is easily stated, but hard to solve; it has
become the prototypical hard problem in theoretical
computer science. A large part of the extensive
research conducted by IBM in the broad area of
optimization, or mathematical programming, contributed
to or was inspired by aspects of this challenging
problem. This article reviews some of that work as well
as recent developments in techniques that were used on
the largest traveling salesman problem ever solved.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1180 (Optimisation techniques); C1290 (Applications
of systems theory)",
classification = "912; 921",
corpsource = "Acad. Inf. Syst., IBM, White Plains, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "combinatorial problems; heuristic methods;
mathematical programming; operations research;
optimisation; optimization; permutations; traveling
salesman problem",
treatment = "T Theoretical or Mathematical",
}
@Article{Langdon:1984:EIA,
author = "Glen G. {Langdon, Jr.}",
title = "Erratum: {``An introduction to arithmetic coding''}",
journal = j-IBM-JRD,
volume = "28",
number = "4",
pages = "498--498",
month = jul,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A29",
MRnumber = "85h:94016b",
bibdate = "Sat Feb 24 09:36:11 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Langdon:1984:IAC}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Taylor:1984:SAM,
author = "Richard L. Taylor",
title = "Software Architecture for a Mature Design Automation
System",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "501--511",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The software structure portion of an architecture for
a design automation system is described; interactive
and foreground design applications are stressed. The
structure involves a uniform set of services, such as
command languages and terminal access methods, needed
to support the design application, and a formal,
two-part partitioning of the design application itself.
Modularity and good interfaces are important parts of
the software structure which permit a development
laboratory to change the application enough for it to
be easily used.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7410D (Electronic engineering computing)",
classification = "723",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automation system; CAD; command languages; computer
aided design; computer architecture; computer software;
design; distributed data; distributed processing;
electronic design; electronic engineering computing;
IBM; interfaces; method; software architecture;
terminal access",
treatment = "P Practical",
}
@Article{Capelli:1984:DIG,
author = "Ronald B. Capelli and George C. Sax",
title = "A device-independent graphics package for {CAD}
applications",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "512--523",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "GSSP (Graphics Support Subroutine Package) is a
device-independent two-dimensional graphics package
developed by Engineering Design System (EDS) to support
several major electronic and mechanical computer-aided
design applications within IBM. Graphics systems
supported range from interactive, high-function,
distributed-graphics workstations to passive
graphic-output devices. GSSP provides many of the
functions usually found in other device-independent
graphics packages, with additional support for
hierarchically structured display files and distributed
graphics systems. The major functions provided by GSSP
are described, and an overview of the implementation is
presented to show how issues such as interactive
performance and human factors are addressed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7410D (Electronic
engineering computing); C7440 (Civil and mechanical
engineering computing)",
classification = "723",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; CAD applications; computer aided design; computer
graphics; device-independent two-; dimensional graphics
package; distributed-graphics workstations; electronic
CAD; electronic engineering computing; Engineering
Design Systems; graphics support subroutine package;
Graphics Support Subroutine Package; GSSP;
hierarchically structured display files; human factors;
IBM; interactive performance; mechanical CAD;
mechanical engineering computing; output devices;
passive graphic-; software packages",
treatment = "A Application; P Practical",
}
@Article{Alvarodiaz:1984:ISV,
author = "Rita R. Alvarodiaz and Walter H. Elder and Peter P.
Zenewicz",
title = "An interactive system for {VLSI} chip physical
design",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "524--536",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Federal Systems Division has developed a
structured design methodology and a companion chip
physical design system that has been used to build
seven large VLSI chips (ranging in size from 7K to 36K
logic primitives). Using the MVISA system, a logic
designer has complete control and responsibility for
the total chip design. The authors experience has been
that when this highly interactive software and
methodology is used, chip physical design requires less
than two weeks. This is a significant savings in design
time; but more importantly the designer can allocate
more schedule for logic design and simulation. This
paper describes how FSD's unique interactive physical
design system has improved productivity of VLSI
design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); C5210B
(Computer-aided logic design); C7410D (Electronic
engineering computing)",
classification = "713; 723",
corpsource = "IBM Federal Syst. Div., Masassas, VA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit CAD; computer aided design; computer software;
Federal; IBM; integrated circuits, VLSI --- Design;
interactive system; interactive systems; logic CAD;
logic design; MVISA; productivity; simulation;
structured design methodology; system; Systems
Division; VLSI; VLSI chip physical design",
treatment = "P Practical",
xxauthor = "W. H. Elder and P. P. Zenewicz and R. R. Alvarodiaz",
}
@Article{Darringer:1984:LSP,
author = "John A. Darringer and Daniel Brand and John V. Gerbi
and William H. {Joyner, Jr.} and Louise Trevillyan",
title = "{LSS}: a System for Production Logic Synthesis",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "537--545",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the evolution of the Logic
Synthesis System from an experimental tool to a
production system for the synthesis of masterslices
chip implementations. The system was used by one
project in IBM Poughkeepsie to produce 90 percent of
its more than one hundred chip parts. The primary
reasons for this success are the use of local
transformations to simplify logic representations at
several levels of abstraction, and a highly cooperative
effort between logic designers and synthesis system
designers to understand the logic design process
practiced in Poughkeepsie and to incorporate this
knowledge into the synthesis system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265 (Digital electronics); C5210B (Computer-aided
logic design); C7410D (Electronic engineering
computing)",
classification = "721; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; computer aided design; IBM; local; logic CAD;
logic design; logic representations; logic synthesis;
logic synthesis system; Logic Synthesis System; LSS;
masterslice chip implementations; production; system;
transformations",
treatment = "P Practical",
}
@Article{Gilkinson:1984:ATM,
author = "James L. Gilkinson and Amir Hekmatpour and Steven D.
Lewis and Bruce B. Winter",
title = "Automated Technology Mapping",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "546--556",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Motivated initially by the problem of test case
generation for new technologies, a logic transformation
system, known as the Technology Mapping System (TMS),
was developed. This system has focused on the problem
of technology-to-technology mapping involving gate
array or standard cell logic families. TMS makes use of
an intermediate notation, called GLN, and uses several
forms of `rules' to control the mapping process. This
paper discusses the history and general operation of
TMS, and makes a comparison of transformations from
different types of sources.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); C5210B (Computer-aided logic
design)C7410D (Electronic engineering computing)",
classification = "721; 723",
corpsource = "IBM Syst. Products Div., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "array; cellular arrays; computer aided design; gate;
high-level design language; logic CAD; logic design;
logic mapping; logic transformation system; standard
cell logic families; Technology Mapping System;
technology mapping system; TMS; transformation",
treatment = "P Practical",
xxauthor = "J. L. Gilkinson and S. D. Lewis and B. B. Winter and
A. Hekmatpour",
}
@Article{Maissel:1984:HDD,
author = "Leon I. Maissel and Hillel Ofek",
title = "Hardware Design and Description Languages in {IBM}",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "557--563",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Hardware design languages (HDLs) allow computer
hardware to be described in sufficient detail to be
simulated and built, such a description being at a
sufficiently high level of abstraction to make the
complete design readily intelligible to anyone skilled
in that language. A number of HDLs have been developed
and are in use in IBM. To date, no overwhelming case
can be made for choosing any one HDL over the others.
The major trends in HDL are discussed. Several examples
of HDLs are presented in some detail. VHDL, the
yet-to-be released HDL which is to serve as a front end
to the U. S. Government's Very High Speed Integrated
Circuits program, is among these.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C7410D (Electronic
engineering computing)",
classification = "713; 722; 723",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer; computer programming languages; computers;
description languages; digital hardware; electronic
engineering computing; hardware; hardware design
languages; HDL; high level languages; IBM; integrated
circuits; VHDL",
treatment = "P Practical",
}
@Article{Barzilai:1984:UHS,
author = "Zeev Barzilai and Daniel K. Beece and Leendert M.
Huisman and Gabriel M. Silberman",
title = "Using a Hardware Simulation Engine for Custom {MOS}
Structured Designs",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "564--571",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Mixed-level simulation techniques are widely used in
VLSI designs for verification and test evaluation. This
paper indicates how to perform mixed-level simulation
on structured MOS designs using the Yorktown Simulation
Engine (YSE), a hardware simulator developed at IBM. On
the YSE, simulation can be done at the functional,
gate, and transistor levels. The design specification
used by the YSE is well suited for mixed-level
simulation, particularly with regard to interfacing the
different levels. Techniques are applied to an nMOS
design to show the important features of our
approach.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570F (Other MOS integrated circuits); C7410D
(Electronic engineering computing)",
classification = "714; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit CAD; circuits; custom MOS structured designs;
digital simulation; Engine; field effect integrated;
functional level; gate level; hardware simulation
engine; IBM; integrated circuits, VLSI; mixed-level
simulation; NMOS design; semiconductor devices, MOS;
transistor level; VLSI; VLSI designs; Yorktown
Simulation; Yorktown Simulation Engine; YSE",
treatment = "P Practical",
}
@Article{Fiebrich:1984:PSL,
author = "Rolf-Dieter Fiebrich and Yuh-Zen Liao and George
Koppelman and Edward Adams",
title = "{PSI}: a Symbolic Layout System",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "572--580",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A symbolic layout tool, PSI, is described for use with
IBM circuit technology. Significant features of PSI are
used with multiple circuit technologies, adaptation to
rapid changes of technology design rules, creation of
nested designs, and extensive designer control over the
spacing process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
C7410D (Electronic engineering computing)",
classification = "713; 721; 723",
corpsource = "Thinking Machines Corp., Waltham, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit layout CAD; computer aided design; computers;
designer control; IBM circuit technology; integrated
circuits; multiple circuit technologies; nested
designs; PSI; spacing process; symbolic layout;
symbolic layout system; technology design rules",
treatment = "P Practical",
xxauthor = "R.-D. Fierich and Y.-Z. Liao and G. Koppelman and E.
Adams",
}
@Article{Cook:1984:CSG,
author = "Peter W. Cook",
title = "Constraint Solver for Generalized {IC} Layout",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "581--589",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The essential features of the constraint solver, which
is intended to place few restrictions on the source of
the constraints to be solved, are that it accommodate
mixed equality and inequality constraints, that it
allow selective `maximization' of variables, that it
proceed with any number of variables given user-defined
values, and that it fail to produce a solution only
when no solution exists. These features all flow from
the desire to provide a constraint solver suitable for
use in an `open' system, in which there are no
restrictions on the form or order of the constraints.
The algorithm presented meets these objectives while
remaining reasonable in its use of storage and time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); C7410D
(Electronic engineering computing)",
classification = "713; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; circuit layout CAD; computer aided design;
constraint solver; equality constraints; inequality
constraints; integrated circuits; layout system; open;
selective variable maximisation; symbolic IC layout
system; system",
treatment = "P Practical",
}
@Article{Barone:1984:CCC,
author = "A. M. Barone and J. K. Morrell",
title = "{Custom Chip\slash Card Design System}",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "590--595",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Custom Chip\slash Card Design System (CCDS) is a
set of software applications, tied together via a
common data interchange, that is used for the design,
analysis, and checking of custom electronic circuits.
CCDS is intended to unite the separate electrical,
logical, and physical design phases and a single design
process. The underlying principle of the system rests
on the idea of describing the product as a generalized
network, with multiple overlapping views that
correspond to the different design phases. In addition
to the applications contained within CCDS, there are
also links to other software tools for such things as
circuit simulation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
C7410D (Electronic engineering computing)",
classification = "713; 723",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic testing; CCDS; circuit analysis; circuit
CAD; circuit checking; circuit design; circuit
simulation; common data interchange; computer aided
design; computer simulation; computer software; Custom
Chip/Card Design; custom chip/card design system;
custom electronic circuits; electrical design;
electronic circuits; generalized; logical design;
multiple overlapping views; network; physical design;
software applications; System",
treatment = "P Practical",
}
@Article{Hauge:1984:ASC,
author = "Peter S. Hauge and Ellen J. Yoffa",
title = "{ACORN}: a System for {CVS} Macro Design by Tree
Placement and Tree Customization",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "596--602",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "ACORN is a system for the physical design of cascade
voltage switch (CVS) macros which utilizes tree
placement and tree customization to improve macro
wirability. The results obtained by designing a 43-tree
differential (DCVS) macro on a masterslice chip image
are presented to illustrate the design improvements. In
this example, tree placement reduces wire length and
via count by 12 percent relative to a transistor-pair
placement design. Tree customization increases this
improvement to 25 percent, and increases the porosity
of the wired macro to vertical global wires from 8
percent for tree placement alone to 15 percent.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); C5210B (Computer-aided logic
design)C7410D (Electronic engineering computing)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(mathematics); acorn; ACORN; cascade voltage switch;
cascode voltage switch macros; cellular arrays;
computer aided design; differential macro; integrated
logic circuits; logic CAD; macro; macro design;
masterslice chip image; physical design; placement;
porosity; tree; tree customization; trees; vertical
global wires; via count; wirability; wire length",
treatment = "P Practical",
}
@Article{Elmendorf:1984:KMU,
author = "Peter C. Elmendorf",
title = "{KWIRE}: a Multiple-Technology, User-Reconfigurable
Wiring Tool for {VLSI}",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "603--612",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a VLSI design environment where a range of chip
technologies are available and concurrent chip designs
are commonplace, it is not feasible to build a wiring
program for each technology. Additionally, a chip's
design methodology may demand specific abilities from a
wiring program. KWIRE was developed to meet the needs
of a multiple-technology, multiple-methodology VLSI
design community. It has been used on a range of chips,
from small designs to custom microprocessors. Modeling
the users' designs and design rules in geometric terms
allows KWIRE to handle such a diversity of chip
designs. This paper describes the KWIRE system and
router.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); C7410D
(Electronic engineering computing)",
classification = "713; 723",
corpsource = "IBM Commun. Products Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated wire routing; chip; circuit layout CAD;
custom microprocessors; design; design methodology;
integrated circuits, VLSI; KWIRE; multiple technology
user reconfigurable wiring tool; rule modelling;
technologies; VLSI; VLSI design; wiring program",
treatment = "P Practical",
}
@Article{Linsker:1984:IPW,
author = "Ralph Linsker",
title = "Iterative-Improvement Penalty-Function-Driven Wire
Routing System",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "613--624",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes some features of a wire routing
system (VIKING) that has been developed for
interconnection packages, and discusses related
strategies for improving wiring density and quality on
chips and packages. The routing problem for a chip or
interconnection package consists of finding a `legal'
set of paths that accomplishes the required
interconnections. An iterative improvement strategy,
generates an initial wiring configuration which is
successively improved by optimizing the routing, one
connection at a time, with respect to a sequence of
penalty functions. Illegal intermediate wiring
configurations are permitted.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2210B (Printed circuit layout and design); B2570
(Semiconductor integrated circuits); C7410D (Electronic
engineering computing)",
classification = "713; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chip design; circuit layout CAD; directionally
uncommitted planes; electrical crosstalk noise;
embedding effort; functions; global optimization;
integrated circuits; interconnection packages;
iterative-improvement methods; manual; penalty; routed
wire length; signal planes; vias; VIKING; Viking
system; wire crossings; wire routing; wire routing
system",
treatment = "P Practical",
}
@Article{Leet:1984:CLT,
author = "D. Leet and P. Shearon and R. France",
title = "A {CMOS LSSD} test generation system",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "625--635",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Automatic test pattern generators based on the
stuck-fault concept are theoretically inadequate in
their ability to generate test patterns for CMOS
circuits. A new set of pin faults, called CMOS faults,
is discussed that can represent the necessary test
pattern sequences for these circuits. Processing of
these faults by a new test pattern generator, called
the Enhanced Test Generator (ETG), is also described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570D (CMOS integrated circuits); C7410D (Electronic
engineering computing)",
classification = "713; 723",
corpsource = "IBM Gen. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic test pattern generators; automatic testing;
circuit analysis computing; CMOS; CMOS faults; CMOS
LSSD test generation; enhanced test generator; Enhanced
Test Generator; integrated circuit testing; integrated
circuits; pin faults; stuck-fault; stuck-fault concept;
system",
treatment = "P Practical",
}
@Article{Stapper:1984:YMF,
author = "Charles H. Stapper",
title = "Yield Model for Fault Clusters Within Integrated
Circuits",
journal = j-IBM-JRD,
volume = "28",
number = "5",
pages = "636--640",
month = sep,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Generalized negative binomial statistics turns out to
be a model of the fault distribution in very large
chips are wafers with internal defect clusters. This is
expected to influence large chip and full wafer
redundancy requirements. Furthermore, the yield appears
to be affected by an experimental dependence of the
average number of faults on chip area.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240 (Probability and statistics); B2570
(Semiconductor integrated circuits)",
classification = "713; 921",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binomial statistics; fault clusters; fault
distribution; fault location; integrated circuit
testing; integrated circuits; internal defect clusters;
monolithic IC; monolithic integrated circuits;
negative; redundancy; statistical analysis; very large
chips; wafers; yield; yield model",
treatment = "T Theoretical or Mathematical",
}
@Article{Seraphim:1984:PAM,
author = "Donald P. Seraphim and Patrick A. Toole and William T.
Chen and Robert Rosenberg",
title = "Preface: Advances in Materials and Processes for
Printed Circuit Packaging Technology",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "652--654",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The foundation of advanced electronic packaging
manufacturing processing is primarily based on
materials and engineering sciences and includes almost
all of the basic disciplines of the materials
scientist. The papers in this volume include studies in
materials characterization, analytical chemistry,
polymer chemistry, electrochemical reactions, surface
phenomena, diffusion and permeation, mechanics, and
metallurgy. The authors emphasize the tradition of
close collaboration between the inventors and
implementers, and that the goal of this collaboration
was to establish a long-term set of improvements
through fundamental materials, process, and design
actions to allow continued incremental increases in
density and performance.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technology Div, Endicott, NY, USA",
affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classification = "703; 713; 715",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuitization process sciences; electronics packaging
--- Processing; Materials; materials characterization;
mechanical modeling; moisture in polymers; printed
circuit board production; printed circuits",
}
@Article{Marsh:1984:MSD,
author = "Lyle L. Marsh and Ron Lasky and Donald P. Seraphim and
George S. Springer",
title = "Moisture Solubility and Diffusion in Epoxy and
Epoxy-Glass Composites",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "655--661",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The solubility and kinetics of moisture transport
mechanisms in epoxy-type resin and resin-glass
composites have been investigated over a range of
partial pressure and temperature. Moisture
absorption-desorption in these systems is a
quasi-reversible process, the kinetics of which are
non-Fickian (Type II) and dependent on prior history.
The multistaged sorption and transport behavior are
interpreted in terms of multiphase models.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technology Div, Endicott, NY, USA",
affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6475 (Solubility, segregation, and mixing); A6630
(Diffusion in solids); A8160H (Surface treatment and
degradation of composites); B0550 (Composite materials
(engineering materials science)); B0560 (Polymers and
plastics (engineering materials science)); B2830C
(Organic insulation)",
classification = "817; 944",
corpsource = "IBM Syst. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "composite materials; composites; dependent on;
diffusion in solids; environmental degradation; epoxy;
epoxy resins; epoxy-glass; epoxy-glass composites;
glass fibre; kinetics; mechanisms; moisture; moisture
--- Diffusion; moisture absorption-desorption; Moisture
Determination; moisture in polymers; moisture
solubility; moisture transport; moisture transport
mechanisms; multiphase models; multistaged sorption;
non-Fickian type II; organic insulating materials;
partial pressure; polymers; prior history; reinforced
plastics; solid solubility; solubility; temperature;
transport behavior; water absorption; water desorption;
water diffusion",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Berry:1984:BCM,
author = "Brian S. Berry and Walter C. Pritchet",
title = "Bending --- Cantilever Method for the Study of
Moisture Swelling in Polymers",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "662--667",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Self-induced bending of a bilayer strip is shown to be
a simple but sensitive method for the study of water
absorption and swelling in polymers. Expressions for
both the time-dependent and equilibrium curvature of
the strip have been derived, enabling both diffusional
and dilational parameters to be extracted from
experimental data. To illustrate the technique, it is
shown that a vacuum-dried epoxy swells linearly with
water content, at a rate of 0.93\% in volume per weight
percent of water. Desorption into vacuum has been
observed under diffusion-controlled conditions and the
diffusion coefficient for water in the epoxy found to
be 2.5 multiplied by 10** minus **9 cm**2/s at 295 K.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A6630J (Diffusion, migration, and
displacement of impurities in solids); A6845D
(Evaporation and condensation; interface adsorption and
desorption kinetics); A8170 (Materials testing); A8265M
(Sorption and accommodation coefficients (surface
chemistry)); B0560 (Polymers and plastics (engineering
materials science)); B0590 (Materials testing); B2830C
(Organic insulation)",
classification = "801; 815; 944",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "absorption; adhesion; bending; bending cantilever
method; bending kinetics; bilayer strip; dependent
curvature; desorption; desorption in vacuum; diffusion
coefficient for; diffusion coefficient of water;
diffusion in solids; diffusion-controlled conditions;
diffusional parameters; dilatational parameters;
dilational parameters; environmental testing;
equilibrium curvature; experimental data; moisture;
moisture --- Diffusion; Moisture Determination;
moisture swelling; organic insulating materials;
polymer swelling; polymers; printed circuits ---
Materials; self induced; self-induced bending;
sorption; swelling; time; vacuum-dried epoxy; water;
water content",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Bindra:1984:MEMa,
author = "Perminder Bindra and David N. Light and David L.
Rath",
title = "Mechanisms of Electroless Metal Plating: {I}: Mixed
Potential Theory and the Interdependence of Partial
Reactions",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "668--678",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Electroless plating reactions are classified according
to four overall reaction schemes in which each partial
reaction is either under diffusion control or
electrochemical control. The theory of a technique,
based on the observation of the mixed potential as a
function of agitation, concentration of the reducing
agent, and concentration of metal ions, is presented.
By using this technique it is shown that in electroless
copper plating the copper deposition reaction is
diffusion-controlled, while the formaldehyde
decomposition reaction is activation-controlled. Values
of the kinetic and mechanistic parameters for the
partial reactions obtained by this method and by other
electrochemical methods indicate that the two partial
reactions are not independent of each other.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8115L (Deposition from liquid phases (melts and
solutions)); A8160B (Surface treatment and degradation
of metals and alloys); A8245 (Electrochemistry and
electrophoresis)",
classification = "539; 802",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "agitation; chemical reactions --- Reaction Kinetics;
copper; copper deposition; decomposition reaction;
diffusion control; electrochemical control;
electrochemistry; electroless Cu plating; electroless
deposition; electroless metal plating; electroless
plating; electroless plating reactions; formaldehyde;
formaldehyde oxidation; interdependence of partial
reactions; metal ions concentration; mixed potential
theory; reducing agent concentration; Theory",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Bindra:1984:MEMb,
author = "Perminder Bindra and Judith M. Roldan and Gary V.
Arbach",
title = "Mechanisms of Electroless Metal Plating: {II}:
Decomposition of Formaldehyde",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "679--689",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A detailed investigation of the decomposition of
formaldehyde was carried out to account for the fact
that formaldehyde decomposition on Group VIII metals,
e.g., Pd, occurs without simultaneous hydrogen
generation, while on Group IB metals, e.g., Cu,
formaldehyde decomposition is accompanied by hydrogen
evolution. It was found that in principle, metals may
be divided into three main classes: (1) metals with
positive free energy of hydrogen adsorption, (2) metals
with free energy of hydrogen adsorption close to zero,
and (3) metals with negative free energy of hydrogen
adsorption. In the case of class (1) metals
formaldehyde oxidation is accompanied by hydrogen
evolution; for class (2) metals there is no
simultaneous hydrogen evolution; and class (3) metals
show low 6n 51 catalytic activity for formaldehyde
oxidation. Hence, formaldehyde cannot be used as a
reducing agent for electroless plating of class (3)
metals.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8115L (Deposition from liquid phases (melts and
solutions)); A8160B (Surface treatment and degradation
of metals and alloys); A8245 (Electrochemistry and
electrophoresis)",
classification = "539; 802; 804",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "catalytic activity; chemical reactions ---
Decomposition; cyclic voltammetry curves;
electrochemistry; electroless deposition; electroless
metal plating; electroless plating; energy of H$_2$
adsorption; formaldehyde; formaldehyde --- Kinetic
Theory; formaldehyde decomposition; formaldehyde
oxidation; group IB metals; group viii metals; group
VIII metals; H$_2$ generation; hydrogen adsorption;
oxidation; reducing agent; Theory; volcano plots",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Horkans:1984:IEC,
author = "Jean Horkans and Carlos Sambucetti and Voya
Markovich",
title = "Initiation of Electroless {Cu} Plating on Nonmetallic
Surfaces",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "690--696",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Electroless plating of a metal on a dielectric
substrate requires the prior deposition of a catalyst
such as a Pd-Sn colloid consisting of a metallic Pd
core surrounded by a stabilizing layer of Sn ions. The
activation step (deposition of the colloid) is usually
followed by an acceleration step (removal of excess
ionic tin). Adhesion of the deposit to the substrate is
improved by mechanical and chemical pretreatment steps.
An electrochemical method has been developed for
assessing the catalytic activity of Pd-Sn colloids.
Hydrogen sorption in the Pd in the colloid can be
correlated with catalytic activity, since Pd accessible
for the H-sorption reaction is also accessible as the
catalyst for the electroless deposition reaction. These
conclusions have been confirmed by surface analytical
techniques and by functional tests. The efficacy of
various accelerating solutions has also been
assessed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8115L (Deposition from liquid phases (melts and
solutions)); A8160B (Surface treatment and degradation
of metals and alloys); A8245 (Electrochemistry and
electrophoresis); B2210D (Printed circuit
manufacture)",
classification = "539; 713; 801; 802; 942",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accelerating solutions; acceleration step; activation;
activation step; Catalysis; catalyst prior deposition;
catalytic activity assessment; chemical pretreatment
steps; chemical reactions --- Electrolytic; circuits;
colloid; copper; copper plating --- Applications; Cu
adhesion; cyclic-voltammetry; dielectric substrate;
electrochemistry; electroless Cu; electroless
deposition; electroless deposition reaction;
electroless plating; excess ionic Sn removal;
functional tests; layer of Sn ions; manufacture;
metallic Pd core; nonmetallic surfaces; PCB; Pd-Sn;
plating; plating initiation; printed; printed circuits
--- Manufacture; step; surface analytical; techniques;
voltmeters --- Applications",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Kim:1984:MED,
author = "Jungihl Kim and Sheree H. Wen and Dae Young Jung and
Robert W. Johnson",
title = "Microstructure Evolution During Electroless Copper
Deposition",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "697--710",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A study using transmission and scanning electron
microscopy was made of the evolution of the
microstructure of electroless plated Cu on activated
amorphous substrates and on single-crystal Cu grains.
On amorphous substrates activated in a
PdCl$_2$-SnCl$_2$ colloidal solution, Sn atoms
dissolved into the plating solution concurrently with
Cu deposition on the substrate during the initial stage
of deposition. The very small face-centered-cubic
grains of Cu-Pd solid solution agglomerated into much
larger particles and later coalesced into spherical
grains. As the grains grew, they developed
crystallographic facets, impinged upon one another, and
finally covered the entire substrate. Grains of
energetically favorable crystallographic orientation
selectively developed into the columnar structure.
These columnar grains contained subgrains,
dislocations, and twins. Remarkably different
structures were observed for the Cu grown on large
single-crystal grains.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6170J (Etch pits, decoration, transmission
electron-microscopy and other direct observations of
dislocations); A6170N (Grain and twin boundaries);
A6480G (Microstructure); A6855 (Thin film growth,
structure, and epitaxy); A8115L (Deposition from liquid
phases (melts and solutions)); A8160B (Surface
treatment and degradation of metals and alloys); B2210D
(Printed circuit manufacture)",
classification = "539; 933",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "activated amorphous substrates; columnar grains;
columnar structure; copper; copper plating; crystal
microstructure; crystallographic; crystals; Cu-Pd solid
solution; cubic grains; deposited coatings;
dislocations; electroless; electroless Cu plating;
electroless deposition; electroless plating; epitaxial
growth; face-centered-; growth rates; liquid phase;
low-surface-energy copper planes; microscope
examination of materials; microscopes, electron ---
Applications; Microstructure; microstructure evolution;
orientation; PdCl$_2$-SnCl$_2$ colloidal solution;
plating process; printed circuits; printed circuits ---
Manufacture; scanning electron; SEM; single crystal
copper grains; single-crystal Cu grains; subgrains;
substrate orientation; TEM; transmission electron;
transmission electron microscopy; twin boundaries;
twins",
treatment = "X Experimental",
}
@Article{Lee:1984:MMP,
author = "L. C. Lee and V. S. Darekar and C. K. Lim",
title = "Micromechanics of Multilayer Printed Circuit Boards",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "711--718",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Analytical and experimental techniques are reported
for the evaluation of micromechanical components in
multilayer printed circuit boards. The concern in this
investigation comes from the Z-axis thermal mismatch
between epoxy-glass and copper that generates stresses
when the board is subject to a temperature change.
Finite-element modeling for both plated through-holes
(PTH) and buried via (PV) structures is used to
calculate the stresses in the copper barrel and at the
via junctions. A simple experiment is designed to
measure the thermomechanical strain in the PTH barrel.
Also discussed are the PTH peel and PV pull techniques
which have been used to characterize the
barrel-laminate adhesion and the via junction
strength.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technology Div, Endicott, NY, USA",
affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210 (Printed circuits)",
classification = "421; 703; 713",
corpsource = "IBM Syst. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "barrel-laminate adhesion; boards; buried via
structures; electronics packaging --- Thermal Effects;
epoxy-; epoxy-glass and copper; experimental
techniques; finite element analysis; finite element
modelling; finite-element modeling; glass copper
mismatch; junction strength; MLB; multilayer PCB;
multilayer printed circuit; multilayer printed circuit
board (MLB); plated through-holes; printed circuits;
programming via; PTH barrel; PTH peel; PV pull
techniques; stress distributions; Stresses; thermal
expansion; thermal expansion stresses; thermomechanical
strain; via; Z-axis thermal mismatch",
treatment = "X Experimental",
}
@Article{Kelly:1984:OIB,
author = "John H. Kelly and Chun K. Lim and William T. Chen",
title = "Optimization of Interconnections Between Packaging
Levels",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "719--725",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In large-scale integrated circuits, the interface
between ceramic modules and the next level ---
epoxy-glass circuit boards or cards --- contains a
large number of pin arrays. Because the modules and the
card are usually quite rigid and mechanically strong,
the interface between the module and the card is
commonly the weakest region in the assembly system.
This interface is where the differential deformations
between the two levels of packaging are accommodated.
This paper describes a theoretical and experimental
program to understand the loadings and stresses
present, and to optimize the design of the connecting
pin in order to distribute the stresses more evenly
across the surfaces of the braze joint that connects
the pin to the ceramic module.",
acknowledgement = ack-nhfb,
affiliation = "IBM General Technology Div, Hopewell Junction, NY,
USA",
affiliationaddress = "IBM General Technology Div, Hopewell Junction,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2570 (Semiconductor
integrated circuits)",
classification = "421; 713; 714",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "braze joint; braze joint stress analysis; ceramic
modules; connecting-pin design optimisation;
deformations; Design; differential; differential
deformations; electronics packaging --- Optimization;
epoxy-glass circuit boards; finite-element models;
integrated circuits; integrated circuits, LSI;
interconnections between packaging levels; interface
between ceramic modules; large scale integration;
large-scale; loadings; LSI; MLC modules; module PCB
interface; modules; multilayer ceramic modules;
packaging; pin arrays; printed circuits ---
Manufacture; stresses; stresses --- Thermal; VLSI",
treatment = "P Practical; X Experimental",
}
@Article{Kovac:1984:ITC,
author = "Zlata Kovac and King-Ning N. Tu",
title = "Immersion Tin: its Chemistry, Metallurgy, and
Application in Electronic Packaging Technology",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "726--734",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The surfaces in copper-plated through-holes in printed
circuit boards for complex electronic packaging can be
made solderable by immersion deposition of tin. The
properties of the prepared surfaces vary from those of
`white immersion tin,' which is easily wetted by molten
tin solder, to those of `gray immersion tin,' which is
nearly nonwettable. In this paper, the rate law for tin
deposition in the tin immersion plating bath is
studied. Certain effects of chemical composition of the
plating bath upon the character of the tin layer are
investigated and the effects of thermal annealing of
the plated surface upon the composition of the tin
layer are determined. The differences in composition of
white and gray immersion tin surface coatings are
revealed by X-ray diffraction Rutherford backscattering
spectroscopy and Auger electron spectroscopy.
Solderability tests on Sn, Cu, Cu$_3$Sn, and immersion
tin surfaces are included.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170G (General fabrication techniques); B0530 (Metals
and alloys (engineering materials science)); B0590
(Materials testing); B2210D (Printed circuit
manufacture)",
classification = "539; 546; 713; 802",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Auger electron spectroscopy; backscattering
spectroscopy; chemical reactions --- Electrolytic;
chemistry; composition; copper plating; copper-plated
through-holes; Cu; Cu plated through holes; Cu/sub
3/Sn; deposition rate law; diffusion-controlled
kinetics; electronic packaging technology; gray
immersion tin; heat treatment --- Annealing; immersion
tin bath; immersion tin deposition; immersion tin
surfaces; materials testing; metallurgy; Plating;
printed circuit boards; printed circuits; printed
circuits --- Electronics Packaging; protective
coatings; PTH PCB; Sn; Sn ion deposition; Sn plating;
solderability test; solderability tests; soldering;
thermal annealing; tin; tin and alloys; tinning;
wettability; white immersion tin; X-ray diffraction
Rutherford",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Ginsburg:1984:HSP,
author = "Rochelle Ginsburg and John R. Susko",
title = "High-Temperature Stability of a Polyimide Film",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "735--740",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Polyimide (PMDA-ODA) films were analyzed by mass
spectroscopy to determine their high-temperature
stability. Using a high-resolution instrument, the
identity of the low-molecular-weight evolved gases was
confirmed. With a semiquantitative technique, the
effect of a vacuum pre-bake was shown to reduce
outgassing appreciably during subsequent treatment at
high temperature. Subjection of the films to moisture
did not affect their thermal stability. Low-temperature
processing (240 degree C vs 400 degree C) reduced
gaseous evolution by an order of magnitude.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technology Div, Endicott, NY, USA",
affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6140K (Structure of polymers, elastomers, and
plastics); A8280M (Mass spectrometry (chemical
analysis)); B0560 (Polymers and plastics (engineering
materials science)); B2830C (Organic insulation)",
classification = "703; 713; 801; 815",
corpsource = "IBM Syst. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electronics packaging --- High Temperature Effects;
Film; gaseous evolution; high-temperature stability;
low-; low-molecular-weight; low-temperature processing;
mass spectroscopy; moisture; molecular-weight evolved
gases; ODA; outgassing; PMDA-; polyimide film;
polyimides; polymer films; printed circuits ---
Manufacture; semiquantitative technique; spectroscopy
--- Applications; thermal stability; vacuum prebake
effects",
treatment = "X Experimental",
}
@Article{Schubert:1984:DGC,
author = "Steven A. Schubert",
title = "Determination of {Gafac} in Complex Solution
Matrices",
journal = j-IBM-JRD,
volume = "28",
number = "6",
pages = "741--747",
month = nov,
year = "1984",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This method utilizes a simple methylene chloride
extraction to separate the Gafac from interfering
chemical species, such as cupric sulfate. The
ultraviolet absorbance of the methylene chloride
extract is then measured at 276 nm and is shown to be
proportional to the concentration of Gafac over the
range of 1-170 ppm. However, this relationship is
nonlinear except for concentrations less than 15 ppm.
The limit of detection is 0.6 ppm and the relative
precision at the 10-ppm level is plus or minus 6\%.
Experiments to optimize and characterize various
aspects of the analytical procedure are described,
including determining the absorptivity of Gafac,
measuring the distribution ratio, calculating
extraction efficiencies, optimizing the extraction pH,
and evaluating selected spectral interferences.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technology Div, Endicott, NY, USA",
affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8280D (Electromagnetic radiation spectrometry
(chemical analysis))",
classification = "539; 801; 802; 803; 804; 921",
corpsource = "IBM Syst. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "170 ppm; absorptivity; agents; Analysis; analysis of
surfactants; analytic method; chemical analysis;
concentration range 1 to; Cu plating bath surface
active; distribution ratio; efficiencies; extract;
extraction; extraction --- Optimization; extraction pH
optimisation; Gafac; Gafac concentration measurement;
Gafac in complex solution matrices; methylene chloride;
methylene chloride extraction; multicomponent
solutions; multicomponent systems; Re-610; solutions
--- Electroplating; spectral interferences;
spectrochemical analysis; surface active agents;
ultraviolet absorbance; ultraviolet spectrophotometry;
UV spectrophotometry",
treatment = "P Practical; X Experimental",
}
@Article{Langlois:1985:DEG,
author = "W. E. Langlois",
title = "Dynamical Equations Governing a Lubricating Film
Consisting of a Gas Film Overlying a Liquid Film",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "2--10",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The dynamical equations governing a two-phase
lubricating configuration are derived. It is assumed
that a gas film overlines a liquid film, both thin
enough that the lubrication approximation may be used.
The analysis leads to coupled Reynolds equations
governing the pressure and the relative thickness of
the two films. The coupling, which is determined by
continuity of tangential stress across the gas-liquid
interface, is considerably simplified if the shear
viscosity of the liquid greatly exceeds that of the
gas.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Research Div, San Jose, CA, USA",
affiliationaddress = "IBM, Research Div, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A4715C (Laminar boundary layers); A4790 (Other topics
in fluid dynamics)",
classification = "601; 607; 631; 921",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bearings --- Lubrication; continuity of tangential
stress; coupled Reynolds equations; coupling; dynamical
equations; gas bearings; gas film; gas film overlying;
gas-liquid; hydrodynamic lubrication; interface;
laminar flow; liquid film; lubricating film;
lubrication; lubrication approximation; mathematical
techniques; phase lubricating configuration; pressure;
Reynolds equations; shear flow; shear viscosity; Thin
Films; two-; viscosity",
treatment = "T Theoretical or Mathematical",
}
@Article{Chan:1985:SCS,
author = "Derek Y. C. Chan and Douglas Henderson and Jorge
Barojas and Andrew M. Homola",
title = "Stability of a Colloidal Suspension of Coated Magnetic
Particles in an Aqueous Solution",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "11--17",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Expressions for the magnetic, electrostatic and van
der Waals interactions between isolated magnetic
spheres which are coated with an inert material and
immersed in an aqueous electrolyte solution are
obtained and used to study the stability of a colloid
of spheres in an electrolyte. Use is made of a
simplified version of the theory of colloid stability
of Derjaguin, Landau, Verwey, and Overbeek. We find
that the colloidal dispersion becomes more stable as
(1) the electrolyte concentration is decreased, (2) the
radius of the magnetic spheres is decreased, or (3) the
thickness of the inert layer is increased. In order to
obtain stability with uncoated spheres, the spheres
should have radii of about 5 nm. Such radii are typical
of ferrofluids.",
acknowledgement = ack-nhfb,
affiliation = "Australian Natl Univ, Canberra, Aust",
affiliationaddress = "Australian Natl Univ, Canberra, Aust",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7550M (Magnetic liquids); A8270D (Colloids); B3110
(Magnetic materials)",
classification = "631; 701; 702; 801",
corpsource = "Dept. of Appl. Math., Australian Nat. Univ., Canberra,
ACT, Australia",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aqueous; aqueous electrolyte solution; coated magnetic
particles; coating thickness; colloid chemistry;
colloid of spheres; colloid stability; colloidal
dispersion; colloidal suspension; Derjaguin; Derjaguin
Landau Verwey Overbeeck theory; DLVO theory;
electrolyte concentration; electrolytes; electrostatic
interactions; ferrofluids; flow of fluids --- Spheres;
inert; interaction energy; isolated magnetic; Landau;
layer; magnetic fluids; magnetic interactions; magnetic
properties; Overbeek; solution; sphere size; spheres;
spherical radii; stability; uncoated spheres; van der
Waals interactions; Verwey",
treatment = "T Theoretical or Mathematical",
}
@Article{Marsh:1985:DLI,
author = "L. L. Marsh and D. C. {Van Hart} and S. M.
Kotkiewicz",
title = "Dielectric Loss Investigation of Moisture in
Epoxy-Glass Composites",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "18--26",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Dielectric loss has been used to study moisture
absorption-desorption equilibria and kinetics in
epoxy-glass composites. Measurements were made at a
temperature of 90 degree C and a frequency of 200 Hz to
maximize sensitivity to interfacial or Maxwell-Wagner
polarization. Exposure to various partial pressures of
moisture at that temperature permitted a kinetics
analysis from which an estimate was made of the
diffusivity of water in the composites. Values of
dielectric loss at saturation were used to establish a
moisture\slash dielectric loss calibration at 90 degree
C which can be used to estimate the macroscopic
internal moisture content of coupon samples and printed
circuit cards and boards. Dielectric loss measurements
offer promise as a screening technique for resin-glass
coupler development.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Endicott, NY, USA",
affiliationaddress = "IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0550 (Composite materials (engineering materials
science)); B0590 (Materials testing); B2210 (Printed
circuits); B2830 (Insulation and insulating coatings);
B7310K (Dielectric variables measurement); B7320Z
(Other nonelectric variables measurement)",
classification = "413; 701; 713; 817; 944",
corpsource = "Div. of Syst. Technol., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "absorption-desorption equilibria; analysis;
calibration; composite insulating materials; composite
materials; coupon; dielectric loss; dielectric loss
measurement; Dielectric Properties; diffusivity of
water; epoxy resins; epoxy-; glass; glass composites;
glass coupler development; humidity; interfacial
polarisation; interfacial polarization; kinetics;
macroscopic internal moisture content; materials
testing; Maxwell-Wagner polarization; moisture
diffusion measurement; moisture measurement;
moisture/dielectric loss; PCB; printed circuit boards;
printed circuit cards; printed circuits; printed
circuits --- Moisture Determination; resin-; samples;
screening technique",
treatment = "X Experimental",
}
@Article{Atkinson:1985:CDM,
author = "J. M. Atkinson and R. D. Granata and H. {Leidheiser,
Jr.} and D. G. McBride",
title = "Cathodic Delamination of Methyl Methacrylate-Based Dry
Film Polymers on Copper",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "27--36",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Studies of the bond degradation between a laminated
organic coating and a copper substrate have been
carried out using electrochemical techniques. The
failure of the bond is attributed to a cathodic
reaction which occurs under the coating. The rates of
delamination are shown to be affected by delay time
after exposure, temperature, applied potential,
composition of the electrolyte, and surface abrasion
prior to application of the coating.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Endicott, NY, USA",
affiliationaddress = "IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics (engineering materials
science))B2210 (Printed circuits)",
classification = "415; 539; 544; 804",
corpsource = "Div. of Syst. Technol., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abrasion; after exposure; applied potential; bond
degradation; bond failure; cathodic delamination;
cathodic reaction; coating; composite materials;
composition; copper; copper and alloys; copper
substrate; corrosion protection, cathodic; Cu
substrate; delamination; delay time; dry film polymers;
electrolyte; laminated organic; laminated products;
Manufacture; methyl methacrylate; methyl
methacrylate-based; organic compounds; PCB; polymer
films; printed circuits; surface; temperature",
treatment = "X Experimental",
}
@Article{Brown:1985:DAS,
author = "James A. Brown",
title = "A development of {APL2} syntax",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "37--48",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper develops the rules governing the writing of
APL2 expressions. The derivation of these rules is seen
as the orderly investigation of the usefulness of
written expressions as influenced by a few general
principles. Binding gives one concept that ties
together the concepts of order of execution, precedence
of operators over functions, use of parentheses, etc.
The principles can be phrased in terms of a few simple
rules that are easy to apply in practice, with the
general rule always ready to mediate any apparent
ambiguities. In addition to providing a simplified view
of APL 2 syntax, the principles give a framework under
which other extensions to APL2 can be considered.",
acknowledgement = ack-nhfb,
affiliation = "IBM, San Jose, CA, USA",
affiliationaddress = "IBM, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages)",
classification = "723",
corpsource = "Div. of Gen. Products, IBM., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alp; alp 2; APL; APL2 expressions; APL2 syntax;
computer programming languages; computer systems
programming --- Input Output Programs; computers ---
Debugging; decisions; design; Design; development;
syntax",
treatment = "G General Review",
}
@Article{Takagi:1985:HSS,
author = "N. Takagi and C. K. Wong",
title = "A hardware sort-merge system",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "49--67",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A hardware sort-merge system which can sort large
files rapidly is proposed. It consists of an initial
sorter and a pipelined merger. In the initial sorter,
record sorting is divided into two parts: key-pointer
sorting and record rearranging. The pipelined merger is
composed of several intelligent disks each of which has
a simple processor and some buffers. The hardware sort
system can sort files of any size by using the
pipelined merger repeatedly. The key-pointer sorting
circuit in the initial sorter requires only
unidirectional connections between neighboring cells,
instead of the usual bidirectional ones. The initial
sorter can also generate sorted sequences longer than
its capacity so that the number of merging passes can
be reduced. A new data management scheme is proposed to
run all merging passes in a pipelined fashion.",
acknowledgement = ack-nhfb,
affiliation = "Kyoto Univ, Jpn",
affiliationaddress = "Kyoto Univ, Jpn",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5440 (Multiprocessing
systems); C6130 (Data handling techniques)",
classification = "722; 723",
corpsource = "Kyoto Univ., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; computer hardware; computer
systems programming --- Sorting; data; file
organisation; hardware sort-; intelligent disks; key-;
key-pointer sorting circuit; large files sorting;
management scheme; merge system; pipeline processing;
pipelined merger; pipelined sort-merger; pointer
sorting; record rearranging; record sorting; sort large
files rapidly; sorting; unidirectional connections",
treatment = "A Application; N New Development",
}
@Article{OMalley:1985:ACA,
author = "Lawrence V. O'Malley",
title = "Adaptive Clustering Algorithm",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "68--72",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Output data from many types of sensor systems (radar,
radar warning, sonar, electro-optical, etc.) must be
associated with one or more possible sources based on
multiple observations of the data. This paper presents
an algorithm that associates data with their source by
simultaneous n-dimensional clustering of multiple data
observations. The algorithm first orders the
observations by successive nearest neighbor, in the
n-dimensional Euclidean sense, from a defined starting
point. Clusters are then isolated using a method
derived from statistical decision theory. The
algorithm's primary feature is its ability to perform
clustering adaptively without any assumptions about the
size, number, or statistical characteristics of the
clusters. Since the algorithm was developed for radar
warning system processing, a performance comparison
with a well-known algorithm used in that field is
included.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Owego, NY, USA",
affiliationaddress = "IBM, Owego, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B6320 (Radar
equipment, systems and applications); C7410F
(Communications computing)",
classification = "716; 723",
corpsource = "Div. of Federal Syst., IBM., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adaptive clustering algorithm; alarm systems;
Algorithms; computer programming; computerised signal
processing; data clustering; data processing --- Data
Handling; dimensional clustering; electro-optical;
multiple data observations; multiple observations;
n-dimension clustering; ordered clusters; performance
comparison; pulse bearing angle; radar --- Computer
Applications; radar systems; radar warning system
processing; radar warning systems; simultaneous n-;
sonar; statistical decision theory; successive nearest
neighbor",
treatment = "A Application; G General Review; N New Development",
}
@Article{Mandeville:1985:NMA,
author = "Jon R. Mandeville",
title = "Novel Method for Analysis of Printed Circuit Images",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "73--86",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "To keep pace with the trend toward increased circuit
integration, printed circuit patterns are becoming
denser and more complex. A variety of automated visual
inspection methods to detect circuit defects during
manufacturing have been proposed. This paper describes
a method which is a synthesis of the
reference-comparison and the generic-property
approaches that exploits their respective strengths and
overcomes their respective weaknesses. It is based on
the observation that the local geometric and global
topological correctness of a printed circuit can be
inferred from the correctness of simplified, skeletal
versions of the circuit in a test image. These
operations can be realized using simple processing
elements which are well suited for implementation in
hardware.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control); B2210D
(Printed circuit manufacture); B6140C (Optical
information, image and video signal processing)",
classification = "703; 713; 715; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automated methods; automated visual inspection
methods; automatic test equipment; computer aided
analysis; computerised picture processing; defects;
detect circuit; electronic circuits --- Testing;
electronic equipment testing; generic-;
generic-property method; inspection; manufacturing;
method; novel; PCB inspection; printed circuit image
analysis; printed circuits; processing elements;
property; reference-comparison; reference-comparison
method; skeletal versions; Testing; visual methods",
treatment = "A Application; N New Development",
}
@Article{Stapper:1985:EWW,
author = "C. H. Stapper",
title = "Effects of Wafer to Wafer Defect Density Variations on
Integrated Circuit Defect and Fault Distributions",
journal = j-IBM-JRD,
volume = "29",
number = "1",
pages = "87--97",
month = jan,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Yield modelers have to take into account not only the
wafer to wafer variations in defect densities, but also
lot to lot, day to day, week to week, and month to
month variations in defect levels that occur in
integrated circuit fabrication. Models for these
effects are described in this paper. All these models
are based on the application of straightforward,
elementary statistics. They are developed from
fundamental random defect theory and adapted to actual
data by deductive analysis. The effects on defect and
fault distributions are derived; and a deficiency in
some previous yield models is eliminated.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Essex Junction, VT, USA",
affiliationaddress = "IBM, Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240Z (Other topics in statistics); B2570
(Semiconductor integrated circuits)",
classification = "713; 714; 922",
corpsource = "Div. of Gen. Technol., IBM., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "binomial model; defect distribution; density
variations; fault distributions; integrated circuit;
integrated circuit manufacture; LSI; manufacturing;
Monitoring; semiconductor device manufacture;
statistical analysis; statistical methods; technology;
VLSI; wafer partitioning; wafer to wafer defect; yield
models",
treatment = "T Theoretical or Mathematical",
}
@Article{Stanley:1985:MB,
author = "Robert C. Stanley",
title = "Microprocessors in Brief",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "110--131",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a tutorial overview of the past,
present, and future of microprocessors and describes
the key elements of their structure and operation. It
is intended to serve as a technical introduction to the
rapidly expanding field of microprocessor and
microcomputer technology and to provide an overview of
what these elements are, what they can do, and how they
do it. The origin and evolution as well as the basic
principles of operation are discussed. Several
different types of microprocessor are considered and
examples of their application in the solution of
real-world problems are given. A comprehensive
bibliography covering the period from 1971 to 1984 is
included.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Process Automation Group, Boca Raton, FL, USA",
affiliationaddress = "IBM, Process Automation Group, Boca Raton, FL,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips)",
classification = "721; 722; 723",
corpsource = "IBM Syst. Products Div., Boca Raton, FL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Bibliographies; computers, microprocessor;
microcomputer; microprocessor chips; microprocessors;
real-world problems; technology; tutorial overview",
treatment = "G General Review",
}
@Article{Ungerboeck:1985:ADS,
author = "Gottfried Ungerboeck and Dietrich Maiwald and
Hans-Peter Kaeser and Pierre R. Chevillat and Jean Paul
Beraud",
title = "Architecture of a Digital Signal Processor",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "132--139",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A digital signal processor (DSP) is described which
achieves high processing efficiency by executing
concurrently four functions in every processor cycle:
instruction prefetching from a dedicated instruction
memory and generation of an effective operand, access
to a single-port data memory and transfer of a data
word over a common data bus, arithmetic\slash
logic-unit (ALU) operation, and multiplication.
Instructions have a single format and contain an
operand, index control bits, and two independent
operation codes called `transfer' code and `compute'
code. The first code specifies the transfer of a data
word over the common data bus, e.g., from data memory
to a local register. The second determines an operation
of the ALU on the contents of local registers. A fast
free-running multiplier operates in parallel with the
ALU and delivers a product in every cycle with a
pipeline delay of two cycles. The architecture allows
transversal-filter operations to be performed with one
multiplication and ALU operation in every cycle. This
is accomplished by a novel interleaving technique
called ZIP-ing. The efficiency of the processor is
demonstrated by programming examples.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Zurich Research Lab, Zurich, Switz",
affiliationaddress = "IBM, Zurich Research Lab, Zurich, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220 (Computer architecture);
C5260 (Digital signal processing); C5440
(Multiprocessing systems)",
classification = "716; 717; 718; 723",
corpsource = "IBM Res. Div., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arithmetic/logic-unit; common data bus; computer
architecture; computerised signal processing; cycle;
dedicated instruction; digital signal processor;
Digital Techniques; ing; instruction prefetching;
interleaving technique; memory; microprocessor chips;
multiplication; pipeline delay; pipeline processing;
processing efficiency; processor; signal processing;
single-port data memory; transversal-filter operations;
ZIP-",
treatment = "P Practical",
}
@Article{Beraud:1985:SPC,
author = "Jean Paul Beraud",
title = "Signal Processor Chip Implementation",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "140--146",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Very large microprocessors can now be integrated on a
single chip; the integration eliminates packaging
delays and is especially attractive for
performance-oriented processors such as signal
processors. This paper describes a semicustom signal
processor chip. The logic is implemented from an
optimized library of bipolar circuits. Layouts are
compatible and designed to map data flow structures
efficiently. Chip design time has been greatly reduced
through the use of developed CAD tools tailored to our
methodology. The design achieves twice the density that
would be possible (with the same technology) with a
masterslice. The chip's high performance has been
verified with hardware; it provides enough computation
power for 125 second-order filters with 8-kHz sampling
of the input signal.",
acknowledgement = ack-nhfb,
affiliation = "IBM France, Essonnes Lab, Corbeil-Essonnes, Fr",
affiliationaddress = "IBM France, Essonnes Lab, Corbeil-Essonnes, Fr",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265F (Microprocessors and microcomputers); B2570B
(Bipolar integrated circuits); C5130 (Microprocessor
chips); C5260 (Digital signal processing); C7410D
(Electronic engineering computing)",
classification = "713; 714; 716; 717; 718",
corpsource = "IBM France, Corbeil-Essonnes, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar circuits; bipolar integrated circuits; CAD;
chip implementation; circuit CAD; computation power;
computerised; data flow structures; Equipment;
integrated circuits; microprocessor chips;
microprocessors; performance-oriented processors;
processors; second-order filters; signal processing;
signals; tools",
treatment = "N New Development; P Practical",
}
@Article{Galand:1985:VPC,
author = "Claude Galand and Chantal Couturier and Guy Platel and
Robert Vermot-Gauchy",
title = "Voice-Excited Predictive Coder ({VEPC}) Implementation
on a High-Performance Signal Processor",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "147--157",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The authors discuss the implementation of a
medium-bit-rate linear prediction baseband coder on an
IBM bipolar signal processor prototype having a high
processing capacity. They show that the implementation
of our algorithm requires a processing load of 5 MIPS,
with a program size of 5K instructions. Then, the
application of our coder in a normal telephone
environment is discussed, which requires mu-law to
linear PCM conversion and other signal processing
functions such as voice activity detection, automatic
gain control, echo control, and error recovery. Quality
evaluation tests are reported which show that this type
of coder, operating at 7.2 kbps, allows the
transmission of telephone speech with communications
quality. Obtained intelligibility scores and speaker
recognition levels are high enough to demonstrate that
this coder is a good candidate for telephony
applications such as digital trunk transmissions,
satellite speech communications, secure voice
communications, and audio distribution systems.",
acknowledgement = ack-nhfb,
affiliation = "IBM France, La Gaude Lab, La Gaude, Fr",
affiliationaddress = "IBM France, La Gaude Lab, La Gaude, Fr",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B6220
(Stations and subscriber equipment)",
classification = "713; 714; 718; 723; 751; 752",
corpsource = "IBM France, La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic gain control; chips; computerised signal
processing; echo control; encoding; error recovery;
high-performance signal processor; IBM bipolar signal
processor; integrated circuits; intelligibility scores;
medium-bit-rate linear; microprocessor; PCM; prediction
baseband coder; pulse-code modulation; recognition
levels; signal processing --- Equipment; speaker;
speech --- Coding; telephone circuits; telephone
environment; telephone speech; vocoders; voice activity
detection; voice communication; voice-excited
predictive coder (VEPC)",
treatment = "A Application; N New Development; P Practical",
}
@Article{Shichman:1985:PIP,
author = "G. Shichman",
title = "{Personal Instrument (PI)} --- a {PC}-Based Signal
Processing System",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "158--169",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Personal Computer (PC) technology has seen an
enormous growth in the last two years. The PC is likely
to be limited for computation-intensive tasks such as
telecommunications and improved human-factors I/O. At
the same time, there has been another evolving
technology --- VLSI realization of general-purpose
signal processors (SP) which are capable of boosting
the performance levels of standard PCs by almost two
orders of magnitude. With SPs in PCs, we now see
tremendous opportunities for distributing
computation-intensive tasks away from high-performance
mainframe computers; previously formidable tasks such
as speech coding and recognition, pattern and scene
analysis, spectral analysis, high bit-rate
communication, and the like are now all computable by
utilizing a single VLSI module embedded in any standard
personal computer. A signal processing subsystem with
real-time data acquisition and control capabilities has
been developed for the IBM PC and is the topic of this
paper.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Speech
Recognition Group, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent, Speech
Recognition Group, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7210X (Other instrumentation and measurement
systems); B7220 (Signal processing and conditioning
equipment and techniques); C5260 (Digital signal
processing)",
classification = "713; 714; 716; 717; 718; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "acquisition; advanced workstations; analysis;
computation-; Computer Applications; computerised
signal processing; general-purpose signal processor;
high bit-rate communication; integrated circuits, VLSI;
intensive tasks; module; modules; pattern analysis;
pc-based signal processing system; personal instrument
(pi); real-time coprocessor; real-time data; real-time
systems; scene analysis; signal processing; signal
processing equipment; spectral; speech coding; speech
recognition; superfast; system; VLSI",
treatment = "N New Development; P Practical",
}
@Article{Rayfield:1985:ADC,
author = "James T. Rayfield and Harvey F. Silverman",
title = "Approach to {DFT} Calculations Using Standard
Microprocessors",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "170--176",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of the DFT as an everyday tool is now
commonplace, principally due to advances in hardware
technology. Special-purpose VLSI chips for signal
processing are available. This paper describes an
approach which combines the Winograd Fourier Transform
Algorithms (WFTA) with a state-of-the-art 16-bit
general-purpose microprocessor for the purpose of DFT
calculation. The heart of the approach is the
real-input 240-point WFTA, which has been optimized for
time and space. An implementation for the 10-MHz M68000
executes in 10.8 ms. A simple hardware module is
described which implements the optimized software. The
use of the module for the inverse transform and for the
complex case is discussed. Advantages to the approach
taken are the low cost\slash performance ratio and the
general-purpose nature of the system that allows many
non-signal-processing functions to be performed by the
microprocessor.",
acknowledgement = ack-nhfb,
affiliation = "Brown Univ, Lab for Engineering Man\slash Machine
Systems, Providence, RI, USA",
affiliationaddress = "Brown Univ, Lab for Engineering Man/Machine
Systems, Providence, RI, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290Z (Other numerical methods); B1265F
(Microprocessors and microcomputers); B7210X (Other
instrumentation and measurement systems); B7220 (Signal
processing and conditioning equipment and techniques);
C4190 (Other numerical methods); C5130 (Microprocessor
chips); C5260 (Digital signal processing)",
classification = "713; 716; 717; 718; 723; 921",
corpsource = "Div. of Eng., Brown Univ. Providence, RI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computerised signal processing; cost/performance
ratio; DFT; DFT calculations; fast Fourier transforms;
Fourier Transform Algorithm; Fourier Transforms;
hardware module; integrated circuits; inverse;
mathematical transformations; microprocessor chips;
microprocessors; signal processing; signal processing
--- Computer Applications; standard microprocessors;
transform; VLSI; Winograd; Winograd Fourier transform
algorithm (WFTA)",
treatment = "N New Development; P Practical",
}
@Article{Abrams:1985:IPA,
author = "Michael J. Abrams and Annick Blusson and Veronique
Carrere and Phu Thien Nguyen and Yves Rabu",
title = "Image Processing Applications for Geologic Mapping",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "177--187",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of satellite data, particularly Landsat
images, for geologic mapping provides the geologist
with a powerful tool. The digital format of these data
permits applications of image processing to extract or
enhance information useful for mapping purposes.
Examples are presented of lithologic classification
using texture measures, automatic lineament detection
and structural analysis, and use of registered
multisource satellite data. In each case, the
additional mapping information provided relative to the
particular treatment is evaluated. The goal is to
provide the geologist with a range of processing
techniques adapted to specific mapping problems.",
acknowledgement = ack-nhfb,
affiliation = "IBM France, Paris, Fr",
affiliationaddress = "IBM France, Paris, Fr",
ajournal = "IBM J. Res. Develop.",
classcodes = "A9165 (Geophysical aspects of geology and mineralogy);
A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research)",
classification = "481; 723; 741",
corpsource = "IBM France, Paris, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automatic lineament detection; cartography;
computerised picture processing; digital; format;
geologic mapping; geological surveys; geology;
geophysical techniques; image processing; image
processing --- Enhancement; Imaging Techniques; Landsat
images; lithologic classification; mapping problems;
measures; remote sensing; satellite data; structural;
texture",
treatment = "X Experimental",
}
@Article{Todd:1985:PRC,
author = "Stephen Todd and Glen G. {Langdon, Jr.} and Jorma
Rissanen",
title = "Parameter Reduction and Context Selection for
Compression of Gray-Scale Images",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "188--193",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In the compression of multilevel (color or gray) image
data, effective compression is obtained economically by
judicial selection of the predictor and the
conditioning states or contexts which determine what
probability distribution to use for the prediction
error. The authors provide a cost-effective approach to
the following two problems: (1) to reduce the number of
coding parameters to describe a distribution when
several contexts are involved, and (2) to choose
contexts for which variations in prediction error
distributions are expected. They solve Problem 1
(distribution description) by a partition of the range
of values of the outcomes into equivalence classes,
called buckets. The result is a special decomposition
of the error range. Cost-effectiveness is achieved by
using the many contexts only to predict the bucket
(equivalence class) probabilities. They solve Problem 2
(economical contexts) by using the buckets of the
surrounding pixels as components of the conditioning
class. The bucket values have the desirable properties
needed for the error distributions.",
acknowledgement = ack-nhfb,
affiliation = "IBM, United Kingdom Scientific Cent, Winchester,
Engl",
affiliationaddress = "IBM, United Kingdom Scientific Cent, Winchester,
Engl",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723; 741",
corpsource = "IBM UK Sci. Centre, Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Analysis; buckets; classes; coding; compression;
conditioning class; context selection; data
compression; encoding; equivalence; error
distributions; gray-scale images; image processing;
parameter reduction; parameters; picture processing;
prediction error distributions",
treatment = "T Theoretical or Mathematical",
}
@Article{Haas:1985:RSM,
author = "Peter J. Haas and Gerald S. Shedler",
title = "Regenerative Simulation Methods for Local Area
Computer Networks",
journal = j-IBM-JRD,
volume = "29",
number = "2",
pages = "194--205",
month = mar,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68M10 (60K99 68U20 94A05)",
MRnumber = "86m:68006",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Local area computer network simulations are inherently
non-Markovian in that the underlying stochastic process
cannot be modeled as a Markov chain with countable
state space. The authors restrict attention to local
network simulations whose underlying stochastic process
can be represented as a generalized semi-Markov process
(GSMP). Using `new better than used' distributional
assumptions and sample path properties of the GSMP,
they provide a `geometric trials' criterion for
recurrence in this setting. They also provide
conditions which ensure that a GSMP is a regenerative
process and that the expected time between regeneration
points is finite. Steady-state estimation procedures
for ring and bus network simulations follow from these
results.",
acknowledgement = ack-nhfb,
affiliation = "Stanford Univ, Dep of Operations Research, Stanford,
CA, USA",
affiliationaddress = "Stanford Univ, Dep of Operations Research,
Stanford, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5620L (Local area networks); C7430 (Computer
engineering)",
classification = "716; 718; 723",
corpsource = "Dept. of Open Res., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bus network; computer networks; digital simulation;
evaluation; generalized semiMarkov process; local area;
local area computer networks; local area networks;
Local Networks; performance; points; properties;
recurrence; regeneration; regenerative process;
regenerative simulation; ring network; sample path;
stochastic process",
treatment = "T Theoretical or Mathematical",
}
@Article{Knepper:1985:ABT,
author = "Ronald W. Knepper and Santosh P. Gaur and Fung-Yuel
Chang and G. R. Srinivasan",
title = "Advanced Bipolar Transistor Modeling: Process and
Device Simulation Tools for Today's Technology",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "218--228",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A series of programs has been developed and linked
together for doing advanced transistor modeling. The
strategy begins with a process modeling program,
SAFEPRO, for predicting two-dimensional impurity
profiles. These are input to a two-dimensional device
physics modeling program, 2DP, for generating device
electrical characteristics. A three-dimensional
distributed device model is then assembled by a model
generator program (MGP) which, in turn, is used to
derive a lumped equivalent-circuit model for numerical
circuit analysis. The tools make it possible to do
process sensitivity studies, perform process and device
optimization, and provide early feedback on technology
performance. The approach has recently been used to
examine and compare various technologies at IBM.",
acknowledgement = ack-nhfb,
affiliation = "IBM, General Technology Div, Exploratory Devices
Project, Hopewell Junction, NY, USA",
affiliationaddress = "IBM, General Technology Div, Exploratory Devices
Project, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors)",
classification = "714; 723; 921",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; bipolar transistor modeling; bipolar
transistors; device; device electrical characteristics;
device models; digital simulation; dimensional
distributed device model; electric networks ---
Equivalent Circuits; IBM; integrated circuits ---
Computer Simulation; lumped equivalent-circuit model;
Mathematical Models; mathematical techniques --- Finite
Element Method; model generator; model generator
program (MGP); numerical circuit; numerical circuit
analysis; process modeling program; process sensitivity
studies; process simulation; profiles; program;
SAFEPRO; semiconductor; semiconductor application of
finite elements to processing (SAFEPRO).; simulation
tools; three-; transistors, bipolar; two-dimensional
impurity",
treatment = "P Practical",
}
@Article{OBrien:1985:TPM,
author = "Redmond R. O'Brien and C. M. Hsieh and J. Scott Moore
and R. F. Lever and P. C. Murley and Karen W. Brannon
and G. R. Srinivasan and Ronald W. Knepper",
title = "Two-Dimensional Process Modeling: a Description of the
{SAFEPRO} Program",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "229--241",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the development, testing, and
application of a finite element program, the SAFEPRO
program (Semiconductor Applications of Finite Elements
to PROcessing), which simulates the processes used in
manufacturing transistors. The profiles calculated by
the program can be input directly into a device
analysis program. The paper includes a description of
the physical phenomena modeled and explains the choice
of the particular numerical methods used to solve the
resulting equations. It shows an example of the
application of the program to the design and
sensitivity study of a submicrometer shallow-junction
bipolar transistor and presents results obtained when
an oxide is grown on boron-doped silicon.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Computer Aided Device Design Dep, Hopewell
Junction, NY, USA",
affiliationaddress = "IBM, Computer Aided Device Design Dep, Hopewell
Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors); C7410D
(Electronic engineering computing)",
classification = "714; 921",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar transistors; device analysis program;
electronic engineering computing; element program;
finite; finite element analysis; mathematical models;
mathematical techniques --- Finite Element Method;
numerical methods; Processing; SAFEPRO program; SAFEPRO
program (semiconductor applications of finite elements
to); semiconductor device models; semiconductor
devices; submicrometer shallow-junction bipolar
transistor; transistors, bipolar --- Processing;
two-dimensional process modeling; two-dimensional
process modelling",
treatment = "P Practical",
}
@Article{Gaur:1985:TDS,
author = "Santosh P. Gaur and Peter A. Habitz and Young-June
Park and Robert K. Cook and Yi-Shiou Huang and Lawrence
F. Wagner",
title = "Two-Dimensional Device Simulation Program: {2Dp}",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "242--251",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Mathematical details of a two-dimensional
semiconductor device simulation program are presented.
Applicability of the carrier transport model to shallow
junction bipolar transistors is discussed. Use of this
program to optimize device structures in new bipolar
technology is illustrated by presenting calculated
device characteristics for variations in a few selected
process conditions. Software links that automatically
transfer data from a two-dimensional process simulation
program and to a quasi-three-dimensional device
equivalent circuit model generation program are also
discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Device Physics Technology Dep, Hopewell Junction,
NY, USA",
affiliationaddress = "IBM, Device Physics Technology Dep, Hopewell
Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors); C7410D
(Electronic engineering computing)",
classification = "714; 723",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bipolar technology; bipolar transistors; carrier
transport model; Computer Simulation; device models;
digital simulation; equivalent circuit model; process
conditions; quasi-three-dimensional device equivalent
circuit model; semiconductor; semiconductor devices;
shallow junction bipolar; shallow junction bipolar
transistors; transistors; transistors, bipolar ---
Mathematical Models; two-dimensional device simulation
program (2dp); two-dimensional semiconductor device
simulation program",
treatment = "P Practical",
}
@Article{Chang:1985:GTB,
author = "Fung-Yuel Chang and Lawrence F. Wagner",
title = "Generation of Three-Dimensional Bipolar Transistor
Models for Circuit Analysis",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "252--262",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The results of a two-dimensional bipolar numerical
device-analysis program are processed by identifying
three regions of the transistor: the intrinsic
transistor, the sidewall transistor, and the extrinsic
base collector diode. The key parameters which describe
each of these regions are extracted using a linking
program and fed into a quasi-three-dimensional device
analysis program referred to here as the Model
Generation Program (MGP). The MGP first generates a
large equivalent-circuit distributed network which
simulates the three-dimensional geometry of an actual
transistor. This distributed network is then analyzed
using the existing Advanced Statistical Analysis
Program (ASTAP) for circuit analysis. Finally the MGP
extracts parameters from the ASTAP analysis to
characterize the elements of a lumped-model equivalent
circuit, which is then suitable for the circuit design
of large-scale integrated circuit chips. The MGP is
sufficiently that transistors with a variety of
geometries can be generated without repeating the
two-dimensional analysis.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Bipolar Device Design \& Modeling Dep, Hopewell
Junction, NY, USA",
affiliationaddress = "IBM, Bipolar Device Design \& Modeling Dep,
Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2560B (Semiconductor device modelling and equivalent
circuits); B2560J (Bipolar transistors); B2570B
(Bipolar integrated circuits); C7410D (Electronic
engineering computing)",
classification = "714; 723; 921",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "advanced statistical analysis program; advanced
statistical analysis program (ASTAP); analysis
computing; bipolar integrated circuits; bipolar
transistors; circuit; circuit analysis; Computer
Simulation; device-analysis program; dimensional
geometry; equivalent circuits; equivalent-circuit
distributed network; extrinsic base collector diode;
integrated circuits --- Computer Aided Analysis;
integration; intrinsic transistor; large scale; large-;
lumped-model equivalent circuit; model generation;
model generation program (MGP); numerical; program;
scale integrated circuit; semiconductor device models;
sidewall; three-; three-dimensional bipolar transistor
models; transistor; transistors, bipolar;
two-dimensional bipolar numerical device-analysis
program",
treatment = "P Practical",
}
@Article{Borucki:1985:FSF,
author = "Leonard Borucki and Howard H. Hansen and Khodadad
Varahramyan",
title = "{FEDSS} --- a {2D} Semiconductor Fabrication Process
Simulator",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "263--276",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The main features of the finite element semiconductor
process simulator Finite Element Diffusion Simulation
System (FEDSS) are described, with emphasis on a
recently added capability for generalized 2D oxidation
with impurity redistribution in oxide and silicon.
Examples are given that demonstrate the ability of the
program to oxidize various structures using a model
based on steady-state oxidant diffusion and
incompressible viscous oxide flow. Impurity profiles
and contours are also shown in both neutral and
oxidizing ambients, along with several comparisons with
data or with the program SUPREM II.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Advanced Mathematics \& Engineering Analysis Dep,
Essex Junction, VT, USA",
affiliationaddress = "IBM, Advanced Mathematics \& Engineering
Analysis Dep, Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2570
(Semiconductor integrated circuits); C7410D (Electronic
engineering computing)",
classification = "714; 723; 921",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2D oxidation with impurity redistribution in oxide and
silicon; Computer Simulation; digital simulation;
distribution; finite element analysis; finite element
diffusion simulation system (FEDSS); finite element
semiconductor process; impurity; impurity profiles;
impurity redistribution; incompressible viscous oxide
flow; integrated circuit technology; integrated
circuits; mathematical techniques --- Finite Element
Method; monolithic; oxidant diffusion; oxidation;
semiconductor device manufacture; simulator;
steady-state; steady-state oxidant diffusion",
treatment = "P Practical",
}
@Article{Cottrell:1985:VWC,
author = "Peter E. Cottrell and Edward M. Buturla",
title = "{VLSI} Wiring Capacitance",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "277--288",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Accurate prediction of device current and the
capacitance to be driven by that current is key to the
design of integrated logic and memory circuits. A
finite-element algorithm is described which simulates
the capacitance of structures with general shape in two
or three dimensions. Efficient solution of the linear
equations is provided by the incomplete Cholesky
conjugate gradient method. The model is used to
simulate the wiring capacitance of a 1.25-micrometer
VLSI technology. The predicted capacitances of closely
spaced first-metal polycide-gate and second-metal
conductors used in this technology agree with measured
results. The simulated three-dimensional capacitance of
a second-metal line crossing a first-metal line is
twice that found when estimated by two-dimensional
models. The effect of line-to-line capacitance on the
noise margin of logic circuits and on the signal in a
dynamic RAM is examined. This capacitance presents a
limit to wiring density for logic circuits and is a
significant signal detractor in dynamic RAMs with
closely spaced metal or diffused bit lines.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Advanced Design Dep, Essex Junction, VT, USA",
affiliationaddress = "IBM, Advanced Design Dep, Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B2570 (Semiconductor
integrated circuits)",
classification = "713; 921; 942",
corpsource = "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; capacitance; Cholesky conjugate gradient
method; closely spaced first-metal polycide-gate;
diffused bit lines; digital integrated circuits;
dynamic RAM; electric measurements --- Capacitance;
Electric Wiring; finite element; finite-element
algorithm; first-metal; incomplete Cholesky conjugate
gradient method; integrated circuits, VLSI;
line-to-line capacitance; logic circuits; logic
circuits --- Mathematical Models; mathematical
techniques --- Finite Element Method; polycide-gate;
second-metal conductors; three-dimensional; VLSI; VLSI
wiring capacitance; wiring density",
treatment = "P Practical",
}
@Article{Laux:1985:SDS,
author = "Steven E. Laux and Robert G. Byrnes",
title = "Semiconductor Device Simulation Using Generalized
Mobility Models",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "289--301",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method for discretizing the semiconductor transport
equations using generalized mobility models is
developed as an extension of the Scharfetter-Gummel
finite difference approach. The method is sufficiently
general to be applicable to nearly arbitrary empirical
mobility models (including those for MOS surface
effects) and may be used on a variety of mesh types in
two or three dimensions. The impact of generalized
mobility models on the sparsity of resulting discrete
equations is discussed. Convergence rate of a Newton's
method linearization of the nonlinear system of
equations is measured and interpreted. Some
computational results from a study of short-channel
MOSFETs are presented to illustrate the approach.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Yorktown Heights,
NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Semiconductor device modelling and equivalent
circuits); C7410D (Electronic engineering computing)",
classification = "714; 723; 921",
corpsource = "Div. of Gen. Technol., IBM Corp., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "carrier mobility; Computer Simulation; convergence
rate; digital simulation; generalized mobility;
generalized mobility models; Gummel finite difference
approach; mathematical techniques --- Finite Difference
Method; mesh types; method linearization; models;
MOSFETs; Newton's; Newton's method linearization;
nonlinear system; Scharfetter-; Scharfetter-Gummel
finite difference approach; semiconductor device;
semiconductor device simulation; semiconductor devices;
semiconductor devices, MOS --- Mathematical Models;
semiconductor devices, MOSFET --- Transport Properties;
semiconductor transport equations; short-channel",
treatment = "P Practical",
}
@Article{Farrell:1985:ACD,
author = "Edward J. Farrell and Steven E. Laux and Phillip L.
Corson and Edward M. Buturla",
title = "Animation and {3D} Color Display of Multiple-Variable
Data: Application to Semiconductor Design",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "302--315",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The increasing complexity of digital simulations
requires more effective techniques to display and
interpret the voluminous outputs. Advanced digital
processing workstations and high-resolution color
monitors permit a wide range of new techniques for use
in examining the global characteristics of each output
variable and their interrelationships with other
variables. In this investigation, animation, 3D
display, and multiple-window imaging have been shown to
be effective in interpreting multiple-variable data
sets, both scalar and vector. These display methods are
used in the solution of two specific semiconductor
design problems: the avalanche breakdown of an n-MOSFET
and an alpha particle hit on an n-p-n transistor. With
these techniques the user can more fully utilize the
results of these long and costly computations, making
these methods a powerful addition to existing
techniques for imaging data.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560 (Semiconductor devices); C7410D (Electronic
engineering computing)",
classification = "723; 741",
corpsource = "Div. of Gen. Technol., IBM Corp., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3D color display; alpha particle hit; animation;
avalanche breakdown; CAD; characteristics; computer
graphics; digital; digital processing workstations;
display devices --- Monitoring; engineering
workstations; global; image processing; Imaging
Techniques; MOSFET; multiple-variable data;
multiple-window imaging; n-; npn transistor;
semiconductor design; semiconductor devices;
semiconductor devices --- Computer Aided Design;
semiconductor devices, MOSFET --- Design; simulations;
transistors --- Design",
treatment = "P Practical",
}
@Article{Bouchard:1985:ECH,
author = "Gilles Bouchard and David B. Bogy and Frank E. Talke",
title = "Experimental Comparison of the Head\slash Disk
Interface Dynamics in 5.25- and 8-inch Disk Drives",
journal = j-IBM-JRD,
volume = "29",
number = "3",
pages = "316--323",
month = may,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A laser Doppler vibrometer is used to measure the
head\slash disk interface dynamics in computer disk
drives. The stability of the head under steady
operating conditions is compared between a 5 one
quarter -inch and two different 8-inch Winchester
drives. In the larger drives, high-frequency vibrations
(between 5 and 10 kHz) are detected on the slider which
are not present in the smaller drive. These vibrations
have amplitudes on the order of magnitude of the
head\slash disk spacing and are related to the rolling
and pitching modes of the slider. The vibrations of the
disk, suspension, and actuator arm are also
investigated and correlated with the results obtained
on the slider.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Device Mechanics Dep, San Jose, CA, USA",
affiliationaddress = "IBM, Device Mechanics Dep, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B7320C (Spatial variables
measurement); C5320C (Storage on moving magnetic
media)",
classification = "722",
corpsource = "Div. of Res., IBM Corp., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "5 1/4 inch disk drives; 8-inch disk drives; actuator
arm; data storage, magnetic; Disk; Doppler effect ---
Laser Applications; Doppler vibrometer; electric drive
--- Vibrations; head/disk interface dynamics; laser;
magnetic disc storage; measurement; measurement by
laser beam; pitching modes; rolling and pitching modes
of slider; rolling modes; stability; suspension;
vibration; Winchester drives",
treatment = "X Experimental",
}
@Article{Chow:1985:AMS,
author = "We-Min Chow and Edward A. MacNair and Charles H.
Sauer",
title = "Analysis of manufacturing systems by the {Research
Queueing Package}",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "330--342",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Many aspects of manufacturing systems can be analyzed
using simulation to model the system's behavior. The
Research Queueing Package (RESQ) is a tool developed to
construct and solve models of systems with jobs
contending for service from many resources. The
capabilities of RESQ are described in order to
understand the model elements which are available for
representing manufacturing systems. Then an analysis of
several work-in-process (WIP) policies is presented
using RESQ models solved by simulation. Four WIP
management policies are analyzed and compared for a
future assembly manufacturing line: (1) a push system,
(2) a pull system, (3) a transfer line, and (4) a
closed loop system.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Advanced Manufacturing Engineering Group, San
Jose, CA, USA",
affiliationaddress = "IBM, Advanced Manufacturing Engineering Group,
San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6115 (Programming support); C7490 (Computing in other
engineering fields)",
classification = "723; 912; 922",
corpsource = "Div. of Gen. Products, IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "closed loop system; computer aided analysis; computer
aided manufacturing; Computer Simulation; computer
software; digital simulation; management;
manufacturing; manufacturing industries; manufacturing
systems; probability --- Queueing Theory; processes;
pull system; push; research queueing package; Research
Queueing Package; RESQ; software tools; system; systems
science and cybernetics; transfer line",
subject = "D.4.8 Software, OPERATING SYSTEMS, Performance,
Queueing theory \\ J.1 Computer Applications,
ADMINISTRATIVE DATA PROCESSING, Manufacturing \\ I.6.3
Computing Methodologies, SIMULATION AND MODELING,
Applications \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS, Modeling techniques \\ F.2.2
Theory of Computation, ANALYSIS OF ALGORITHMS AND
PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Routing and layout",
treatment = "A Application",
}
@Article{Engelke:1985:IMM,
author = "Helmut Engelke and Jens Grotrian and Claus Scheuing
and Arno Schmackpfeffer and Walter Schwarz and Bernhard
Solf and Josef Tomann",
title = "{Integrated Manufacturing Modeling System}",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "343--355",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The objective of the Integrated Manufacturing Modeling
System (IMMS) project was to build a generic software
package for manufacturing modeling. The package allows
interactive model building, testing, and
experimentation. IMMS integrates the fundamental
components of modeling, namely system description, data
acquisition and management, graphic input and output,
and performance simulation. The fundamental idea is to
describe the flow of information, materials, and
resources by using parametric standard model building
blocks. Inputting is done by placing function symbols
on a graphic screen and by filling in blanks for
parameter data. The output includes all common
performance measures, such as utilization and work in
process (WIP), in graphic form. The simulation language
used to implement the model building blocks is RESQ2.",
acknowledgement = ack-nhfb,
affiliation = "IBM Germany, German Manufacturing Technology Cent,
Manufacturing Line Architecture Dep, Sindelfingen, West
Ger",
affiliationaddress = "IBM Germany, German Manufacturing Technology
Cent, Manufacturing Line Architecture Dep,
Sindelfingen, West Ger",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6115 (Programming support); C7490 (Computing in other
engineering fields)",
classification = "723",
corpsource = "German Manuf. Technol. Center, IBM Germany,
Sindelfingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided manufacturing; computer simulation;
computer software; design; digital simulation; generic
software package; IMMS; integrated manufacturing
modeling system; interactive model; manufacturing;
manufacturing industries; modeling; RESQ2; simulation
language; software tools",
review = "ACM CR 8608-0754",
subject = "I.6.3 Computing Methodologies, SIMULATION AND
MODELING, Applications \\ J.6 Computer Applications,
COMPUTER-AIDED ENGINEERING \\ J.1 Computer
Applications, ADMINISTRATIVE DATA PROCESSING,
Manufacturing",
treatment = "A Application",
}
@Article{Haines:1985:ACR,
author = "Calvin L. Haines",
title = "Algorithm for Carrier Routing in a Flexible
Material-Handling System",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "356--362",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Flexible material-handling systems for manufacturing
have the capability of moving articles or carriers
between process stations in different sequences. The
traditional method for controlling the routing of
carriers is to determine, in advance, all of the useful
paths within the system, and store the information in a
central computer until needed. This article describes a
routing algorithm that determines the correct turns a
carrier should make while it is in motion. Making
routing decisions does not require a global knowledge
of the system's layout, because a method of numbering
stations within the system which reflects its natural
path of flow is employed. A brief survey of
contemporary material-handling mechanisms is provided.
The implementation of the algorithm using distributed
controllers is discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM, General Products Div, Tucson, AZ, USA",
affiliationaddress = "IBM, General Products Div, Tucson, AZ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C3320 (Control applications to materials handling);
C3355 (Control applications in manufacturing
processes); C7420 (Control engineering computing)",
classification = "691; 723",
corpsource = "Div. of Gen. Products, IBM, Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "carrier routing; Computer Applications; computer
programming --- Algorithms; computerised materials
handling; distributed control; distributed controllers;
flexible manufacturing systems; flexible
material-handling system; manufacturing; materials
handling; routing algorithm",
treatment = "A Application; P Practical",
}
@Article{Taylor:1985:PME,
author = "Russell H. Taylor and Ralph L. Hollis and Mark A.
Lavin",
title = "Precise Manipulation with Endpoint Sensing",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "363--376",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes recent work on manipulation
strategies that rely on `coarse-fine' robot hardware
and direct sensing of part-workpiece relationships. The
experiments reported use an extremely precise,
high-bandwidth planar `wrist' and an industrial vision
system to perform accurate alignment of small parts.
The system architecture, experimental hardware, and
programming methods employed are all discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Robot Systems Technology Project, Yorktown
Heights, NY, USA",
affiliationaddress = "IBM, Robot Systems Technology Project, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C3120C (Spatial variables control); C3320 (Control
applications to materials handling); C3355 (Control
applications in manufacturing processes); C7420
(Control engineering computing)",
classification = "691; 731",
corpsource = "Div. of Res., IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "alignment; architecture; coarse fine robot hardware;
computer vision; endpoint sensing; hardware; high
bandwidth planar wrist; industrial robots; industrial
vision system; manipulation; Manipulators; materials
handling; position control; precise manipulation;
programming; robotics",
treatment = "P Practical; X Experimental",
}
@Article{Yashchin:1985:ADC,
author = "Emmanuel Yashchin",
title = "On the Analysis and Design of {Cusum-Shewhart} Control
Schemes",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "377--391",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a new approach to design of
CUSUM-Shewhart control schemes and analysis of the
associated run length distributions (under the
assumption that the observations correspond to a
sequence of independent and identically distributed
random variables). This approach is based on the theory
of Markov chains and it enables one to analyze the ARL
(Average Run Length), the distribution function of the
run length, and other quantities associated with a
CUSUM-Shewhart scheme. In addition, it enables one to
analyze situations in which out-of-target conditions
are not present initially, but rather appear after a
substantial period of time during which the process has
operated in on-target mode (steady state analysis). The
paper also introduces an APL package, DARCS, for
design, analysis, and running of both one-and two-sided
CUSUM-Shewhart control schemes and gives several
examples of its application.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1310 (Control system analysis and synthesis
methods)",
classification = "723; 913",
corpsource = "Div. of Res., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL package; average run length; computer software;
control system analysis; control system synthesis;
cumulative sum control charts; CUSUM; Cusum-Shewhart
control schemes; DARCS; DARCS software package;
distribution function; Markov chains; quality control;
run length distributions; sequential hypothesis
testing; Shewhart control schemes",
treatment = "T Theoretical or Mathematical",
}
@Article{Gershwin:1985:SPS,
author = "Stanely B. Gershwin and Ramakrishna Akella and Yong F.
Choong",
title = "Short-Term Production Scheduling of an Automated
Manufacturing Facility",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "392--400",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The authors describe a new implementation of the
Kimemia-Gershwin hierarchical policy for the real-time
scheduling of flexible manufacturing systems. Major
improvements result at all three levels of the policy.
The algorithm simplification, resulting in substantial
reductions of off-line and on-line computation time, is
reported, as is the improvement in performance through
the elimination of chattering. Simulation results based
on a detailed model of a printed circuit card assembly
facility are summarized.",
acknowledgement = ack-nhfb,
affiliation = "MIT, Lab for Information \& Decision Systems,
Cambridge, MA, USA",
affiliationaddress = "MIT, Lab for Information \& Decision Systems,
Cambridge, MA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture); C1290F (Systems
theory applications in industry); C1340B (Multivariable
control systems); C3350Z (Control applications in other
industries); C3355 (Control applications in
manufacturing processes); C7420 (Control engineering
computing)",
classification = "723; 913",
corpsource = "Lab. for Inf. and Decision Syst., MIT, Cambridge, MA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; automated manufacturing facility;
chattering; circuit card assembly; computer aided
manufacturing; flexible; flexible manufacturing
systems; hierarchical policy; hierarchical systems;
Kimemia-Gershwin; manufacturing systems; printed;
printed circuit manufacture; production control;
production scheduling; real-time scheduling;
scheduling; short-term production scheduling",
treatment = "P Practical",
}
@Article{Wittrock:1985:SAF,
author = "Robert J. Wittrock",
title = "Scheduling Algorithms for Flexible Flow Lines",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "401--412",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses scheduling algorithms for a
certain kind of manufacturing environment, called the
`flexible flow line'. Two scheduling problems are
considered. `Loading' decides when each part should be
loaded into the system. `Mix allocation' selects the
daily part mix. The goals are to maximize throughput
and reduce WIP. New heuristic algorithms specially
suited to solve these problems in the context of a
flexible flow line are described. The paper also
discusses experience with the use of an experimental
implementation of these algorithms to solve such
problems arising in a real production line.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Manufacturing
Logistics Group, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent,
Manufacturing Logistics Group, Yorktown Heights, NY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Systems theory applications in industry);
C3350 (Control in industrial production systems); C3355
(Control applications in manufacturing processes)",
classification = "723; 913",
corpsource = "Thomas J. Watson Res. Center, IBM, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer aided manufacturing; computer programming ---
Algorithms; flexible flow; flexible flow lines;
flexible manufacturing system; flexible manufacturing
systems; heuristic algorithms; heuristic programming;
lines; mix allocation; production control; scheduling;
scheduling algorithms",
treatment = "A Application; X Experimental",
}
@Article{Fellenstein:1985:PMK,
author = "Craig Fellenstein and Charles O. Green and Lucinda M.
Palmer and Adrian Walker and David J. Wyler",
title = "A prototype manufacturing knowledge base in {Syllog}",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "413--421",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a prototype knowledge base for
manufacturing planning, which the authors have built
using a knowledge system shell called Syllog. They
describe a Tester Capacity Planning and Yield Analysis
task, knowledge needed for a part of the task, and the
use of the knowledge in the Syllog system. They report
that the sometimes difficult process of knowledge
acquisition turned out, in this case, to be
straightforward. Knowledge acquisition and knowledge
use are done in the same language in Syllog.",
acknowledgement = ack-nhfb,
affiliation = "IBM, General Products Div, Tucson, AZ, USA",
affiliationaddress = "IBM, General Products Div, Tucson, AZ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170E (Production facilities and engineering); B7210B
(Automatic test and measurement systems); C7160
(Manufacturing and industrial administration); C7410D
(Electronic engineering computing)",
classification = "723",
corpsource = "Div. of Gen. Products, IBM, Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "base; computer aided manufacturing; computer software;
electronic engineering computing; electronic equipment;
electronic equipment testing; expert systems;
manufacture; manufacturing data processing;
manufacturing planning; production testing; prototype
manufacturing knowledge; prototype manufacturing
knowledge base; Syllog; testing",
treatment = "A Application; P Practical",
}
@Article{Corongiu:1985:LSA,
author = "Giorgina Corongiu and John H. Detrich",
title = "Large-Scale Scientific Application Programs in
Chemistry and Physics on an Experimental Parallel
Computer System",
journal = j-IBM-JRD,
volume = "29",
number = "4",
pages = "422--432",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The authors present and discuss an experimental
distributed system consisting of two IBM 4341s, and IBM
4381, and ten FPS-164 attached processors, configured
to allow parallel execution of a single large-scale
calculation on multiple processors. A number of their
application programs have been converted to run on this
system, and the strategy for this conversion is
outlined in sufficient detail to facilitate the
development of tests using other scientific and
engineering computer application programs. Their tests,
though limited to certain biochemical and
physicochemical problems, demonstrate the versatility,
flexibility, and accessibility of this system.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Data Systems Div, Kingston, NY, USA",
affiliationaddress = "IBM, Data Systems Div, Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessing systems); C5470 (Performance
evaluation and testing); C7320 (Physics and chemistry
computing)",
classification = "722; 723",
corpsource = "Div. of Data Syst., IBM, Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "biochemical; calculation; chemistry; chemistry
computing; computer programming; computer systems,
digital; computer testing; computing; data processing
--- Natural Sciences Applications; distributed
computing; distributed system; experimental parallel
computer system; FPS-164; IBM 4381; large-scale;
large-scale scientific application programs;
large-scale systems; multiple processors; Parallel
Processing; parallel processing; performance
evaluation; physicochemical; physics",
treatment = "A Application; P Practical",
}
@Article{Williams:1985:DIS,
author = "Thomas H. Williams",
title = "Design and Implementation of the {Selectric
System\slash 2000}",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "443--448",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents an overview of the papers in this
issue covering the design and implementation of the
SELECTRIC System\slash 2000 Typewriter\slash Printer
products. The SELECTRIC System\slash 2000 products
comprise a nonimpact typewriter and printer, two impact
typewriters, and an impact printer which use printwheel
technology. The development approach for the SELECTRIC
System\slash 2000 products, which included design for
automation, introduction of new technologies, and
product development concurrent with manufacturing, was
accomplished by the use of common architecture,
hardware, and software.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays); C5550
(Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "common architecture; computer peripheral equipment ---
Printers; Design; impact printer; impact typewriters;
nonimpact; nonimpact printers; nonimpact typewriter and
printer; printers; printing --- Equipment; printwheel;
printwheel technology; product development; selectric
system/2000; SELECTRIC System/2000; technology;
typewriter; typewriters",
treatment = "P Practical",
}
@Article{Pennington:1985:RRT,
author = "Keith S. Pennington and Walter Crooks",
title = "Resistive Ribbon Thermal Transfer Printing: a
Historical Review and Introduction to a New Printing
Technology",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "449--458",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a new high-quality thermal
transfer printing process in which a printhead
consisting of a linear array of small-diameter
electrodes produces highly localized Joule heating of a
resistive thermal transfer printing ribbon. The heat
generated in the resistive ribbon results in the
melting of a thermoplastic ink which is then
transferred to a printable medium, such as paper, by
contact. The origins of the technology are discussed,
together with a description of the resistive ribbon
materials and structure, the printhead, and some
experimental printer performance values.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Image
Technologies Dep, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent, Image
Technologies Dep, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "723; 745",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Computer Applications; computer peripheral equipment
--- Printers; high-quality thermal transfer printing;
highly; ink; linear array; localized Joule heating;
printer performance values; printhead; printing;
printing technology; resistive ribbon; small-diameter
electrodes; thermal printers; thermal transfer
printing; thermoplastic; thermoplastic ink",
treatment = "N New Development; P Practical",
}
@Article{Applegate:1985:IRR,
author = "Steven L. Applegate and John C. Bartlett and Alan E.
Bohnhoff and Alan S. Campbell and James J. Molloy",
title = "Implementation of the Resistive Ribbon Technology in a
Printer and Correcting Typewriter",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "459--469",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes key technology implementation
details and performance characteristics of a printer
and typewriter using the resistive ribbon technology.
The work describes the commercial application of this
print and correction technology. Key parameters
necessary for proper system function such as current,
various forces, velocities, and component integration
are discussed. The rationales behind various
compromises and problem solutions are given. A
discussion of the characteristics of the print
produced, along with application strengths and
weaknesses, completes the paper.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "component integration; computer peripheral equipment;
correcting typewriter; printer; Printers; printing ---
Equipment; resistive ribbon; resistive ribbon
technology; system function; thermal printers;
typewriters",
treatment = "P Practical",
}
@Article{Twardeck:1985:CRR,
author = "Thomas G. Twardeck",
title = "Characterization of a Resistive Ribbon Thermal
Transfer Printing Process",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "470--477",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Resistive ribbon thermal transfer printers transfer
ink from a ribbon to paper as the result of localized
Joule heating of the ribbon structure. For this
printing process, this paper discusses the
voltage-versus-current response of the electrode-ribbon
current path, the temperature distributions throughout
the ribbon structure, and the correlation of print
response with electrical input power and average ribbon
temperatures. Nominal input power per electrode is
approximately 190 mw. For input power near this level,
thermal models predict that ribbon materials which pass
directly under energized electrodes reach the highest
temperatures; the hottest zone in the ribbon surrounds
the composite-aluminum interface. Approximately 0.1 mm
downstream from the electrodes, the heated ribbon
materials come to nearly constant temperature. The area
of the printed image correlates with this average
ribbon temperature and input power.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745; 804",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; electrode-ribbon
current path; heated ribbon materials; ink --- Heating;
input power; joule heating; localized Joule heating;
print response; Printers; printing --- Heating;
resistive ribbon; ribbon temperatures; temperature
distribution; temperature distributions; thermal
models; thermal printers; thermal transfer printing;
thermal transfer printing process;
voltage-versus-current response",
treatment = "P Practical; X Experimental",
}
@Article{DeFosse:1985:DMS,
author = "Stephen F. DeFosse and George T. Williams and Dominic
A. {Gostomski, Jr.} and Robert H. Cobb",
title = "Development of a Membrane Switch-Type Full-Travel
Tactile Keyboard",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "478--487",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes the approaches to design and the
rationale that satisfied the requirements for a
full-travel keyboard with usage exceeding 10 million
actuations per character, satisfactory N-key roll-over,
and phantom key control. Emphasis was on understanding
the effects of all material and design decisions.
Interactions among design, material, and processing
variables were revealed through statistical parameter
modeling and environmental exposure studies. This
knowledge facilitated the control of critical
parameters to permit an order-of-magnitude reduction of
actuation forces and tolerances. Product reliability
was achieved through evaluation, environmental
protection features, and stringent process controls.
This paper highlights the design, materials, and
processing of the membrane switch developed for
low-force keyboard applications.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2180B (Relays and switches); C5500 (Computer
peripheral equipment)",
classification = "631; 722; 745",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "actuation forces; computer peripheral equipment ---
Printers; environmental exposure; full-travel tactile
keyboard; Keyboards; keyboards; low-force keyboard;
membrane switch-type full-travel tactile keyboard;
membranes --- Switching; modeling; N-key; phantom key
control; process controls; reliability; roll-over;
statistical parameter; switches; typewriters",
treatment = "N New Development; P Practical",
}
@Article{Mayo:1985:SCP,
author = "Randy D. Mayo",
title = "System Control for a Printwheel Typewriter",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "488--493",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents the design goals and architecture
of the IBM WHEELWRITER typewriters. Development efforts
and resulting technical innovations, such as a unique
print hammer design which minimizes sensitivities to
current variations, are discussed. Included is a
discussion of a variable-reluctance stepper motor
driver that has selectable damping. A novel scheme for
initializing the printwheel and escapement motors is
given; this includes sensing the font weight. The
electronic architecture of the typewriter and the
design of a simplified algorithm to handle the many
different keyboards that can be attached to the machine
with a minimum amount of data storage are explained.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C3260B (Electric actuators and final control
equipment); C5550 (Printers, plotters and other
hard-copy output devices)",
classification = "705; 732; 745",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Control; electric drives; electric motors, stepping
type --- Applications; escapement motors; font weight;
hammer design; IBM WHEELWRITER typewriters; keyboards;
print; print hammer; printwheel typewriter; selectable
damping; stepper motor driver; stepping motors;
typewriters; variable-reluctance stepper motor driver;
wheelwriter typewriters",
treatment = "N New Development; P Practical",
}
@Article{Bohnhoff:1985:SCR,
author = "Alan E. Bohnhoff and Donald Croley and Stan Dyer and
Tim Green and Randy Maddox and Lynn M. Struttmann",
title = "System Controls for a Resistive Ribbon Printer",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "494--508 (or 494--507??)",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The system controls for a printer using the resistive
ribbon print technology involve conventional
requirements, such as moving the print mechanism
relative to the paper, with a new requirement,
controlling the electrical energy to the ribbon, an
electrothermal component. Other special requirements
are dictated by using the same ribbon for hard copy
print\slash erase while ensuring that the print and
erase operations are acceptable to the user. This paper
discusses the design and performance of the system
controls for a resistive ribbon printer that was
developed for use in an interactive typewriter
application and as an output printer for a personal
computer.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Information Products Div, Lexington, KY, USA",
affiliationaddress = "IBM, Information Products Div, Lexington, KY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Inf. Products Div., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; electrical energy;
erase operations; hard copy print/erase; interactive
typewriter; output printer; personal computer; print
mechanism; Printers; resistive ribbon printer; system
controls; thermal printers; typewriters; typewriters
--- Accessories",
treatment = "P Practical",
}
@Article{Chieu:1985:ITR,
author = "Trieu C. Chieu and O. Sahni",
title = "Ink Temperatures in Resistive Ribbon Thermal Transfer
Printing",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "509--518",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Knowledge of ink temperatures is important in thermal
transfer printing technologies. This paper reports on
an experimental technique which uses an infrared
radiometric microscope to measure the temperature of
ink deposited by the resistive ribbon process on
transparent substrates. An examination has been made of
the spatial and temporal profiles of ink temperatures
as a function of input current, printing speed,
substrate materials, and number of active electrodes.
The results on a Kapton substrate permit estimation of
the ink temperatures reached during printing on paper.
The peak ink temperatures are observed to depend
linearly on input current and inversely on an
approximately linear function of writing speed from 2
to 8 in\slash sec. The model permits projections to be
made of the current required over a wide range of
printing speeds.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Printer Materials
Group, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent, Printer
Materials Group, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 731; 745; 804; 941; 944",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment --- Printers; infrared
radiometric microscope; ink; ink temperatures; input
current; Kapton substrate; printing; printing ---
Thermal Effects; printing speed; printing speeds;
radiometry; resistive ribbon; resistive ribbon thermal
transfer; spatial profiles; Temperature Control;
temperature measurement; temporal profiles; thermal
printers; thermal transfer printing; transparent
substrates",
treatment = "X Experimental",
}
@Article{Shih:1985:EPR,
author = "Kwang Kuo Shih and Derek B. Dove",
title = "Electrical Properties of Resistive Ribbon",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "519--526",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In resistive ribbon thermal transfer printing, a
printhead consisting of an array of electrodes passes
current into a thin ribbon to generate heat for
transferring ink to paper. The ribbon is made of a
polymeric material containing carbon black so as to be
conducting, and has aluminum deposited on one side of
the ribbon for a base contact. The electrical
conduction processes within the ribbon are discussed.
Current-voltage measurements have been made with
electrodes of various types in order to separate
effects due to contact resistance, aluminum\slash
resistive ribbon interfacial resistance, and bulk
conduction in the resistive ribbon. Measurements have
been made over a range of frequency and temperature to
determine the basic conduction mechanisms. A model of
conduction is presented that is in qualitative
agreement with the data.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, I/O Dep, Yorktown
Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent, I/O Dep,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7310J (Impedance and admittance measurement); C5550
(Printers, plotters and other hard-copy output
devices)",
classification = "701; 722; 745",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bulk conduction; carbon black; computer peripheral
equipment; contact resistance; electric properties;
electrical conduction; electrical conductivity
measurement; interfacial resistance; polymeric
material; polymers; printers; Printers; printhead;
printing --- Thermal Effects; processes; resistive
ribbon; resistive ribbon thermal transfer printing;
thermal; thermal transfer printing",
treatment = "X Experimental",
}
@Article{Laff:1985:TBR,
author = "Robert A. Laff and Claus D. Makowka",
title = "Thermal Behavior of Resistive Ribbon for Single-Stylus
Excitation",
journal = j-IBM-JRD,
volume = "29",
number = "5",
pages = "527--537",
month = sep,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper provides a quantitative description of the
heating and cooling behavior of the resistive ribbon
used in resistive ribbon thermal transfer printing.
Since the focus is upon the ribbon, this description
has been facilitated by substituting a single, tapered
tungsten stylus as a model for a single printhead
element. The experiment used an infrared spot pyrometer
to measure ribbon surface temperatures downstream from
the stylus while a laminate of ribbon and paper was
continuously moved beneath the stylus and subjected to
current pulses. Measured cooling rates under
steady-state excitation at different ribbon velocities
showed a behavior consistent with two simple analytic
models which describe heat loss into the stylus during
heating and two-dimensional diffusion into a half-plane
during cooling. A time-dependent computer simulation
using finite-element methods was used to provide a more
detailed description of the process by taking into
account the local geometry of the heat input
distribution and the layered nature of the ribbon-paper
laminate.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Research Cent, Input-Output
Technologies Dep, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Thomas J. Watson Research Cent,
Input-Output Technologies Dep, Yorktown Heights, NY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7230C (Photodetectors); B7320R (Thermal variables
measurement); C5550 (Printers, plotters and other
hard-copy output devices)",
classification = "722; 745",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; cooling; digital
simulation; excitation; finite-element methods; heat
loss; heating; infrared spot; infrared spot pyrometer;
local geometry; Printers; printhead; printing ---
Equipment; pyrometer; pyrometers; resistive ribbon;
ribbon surface temperatures; single printhead;
single-stylus excitation; steady-state; temperature
distributions; temperature measurement; thermal
printers; thermal transfer printing; three-dimensional;
time-dependent computer simulation",
treatment = "X Experimental",
}
@Article{Patel:1985:ACA,
author = "Arvind M. Patel",
title = "Adaptive Cross-Parity (Axp) Code for a High-Density
Magnetic Tape Subsystem",
journal = j-IBM-JRD,
volume = "29",
number = "6",
pages = "546--562",
month = nov,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an error-correction system,
called adaptive cross-parity (AXP) code, for the IBM
3480, a new high-density 18-track tape storage
subsystem. Redundancy is applied to two interleaved
sets of nine tracks in the same proportion as that in
the previous IBM 3420 tape machines. The coding
structure, however, is simpler, for it avoids the
complex computations of Galois fields. The coding
structure is based on a concept of interacting vertical
and cross-parity checks, where the cross-parity checks
span both sets of tracks and are use in either set in
an adaptive manner. As a result, the overall
error-correcting capability is improved without
increasing the redundancy. Decoding, in which simple
parity equations are processed, is designed to progress
iteratively.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B6120B (Codes); C5320C
(Storage on moving magnetic media)",
classification = "721; 722; 723; 752",
corpsource = "UIBM Div. of Gen. Products, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "18-track; adaptive cross-parity (AXP) code; adaptive
cross-parity code; codes, symbolic --- Error
Correction; compact cartridge; correction codes;
cross-parity checks; data recording; data storage,
magnetic; decoding; encoding; erroneous track; error;
error correction; error-correction system;
high-density; high-density magnetic tape; IBM 3480;
magnetic recording; magnetic tape; magnetic tape
storage; redundancy; structure; subsystem; Tape; tape
storage; tape storage subsystem; vertical and
cross-parity checks",
treatment = "P Practical",
}
@Article{Schneider:1985:WEH,
author = "Richard C. Schneider",
title = "Write Equalization in High-Linear-Density Magnetic
Recording",
journal = j-IBM-JRD,
volume = "29",
number = "6",
pages = "563--568",
month = nov,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Equalization has been used on the read side of a
magnetic-recording channel to obtain a desired signal
shape at the detector. Compensation on the write side
has, for the most part, been limited to moving
transition locations to offset read-signal peak shifts.
This paper presents a new method of equalization on the
write side through the addition of pulses at strategic
locations on the write waveform. The resulting write
current continues to be a two-level signal, so AC bias
is not required. A linear transfer function can be
derived for these write equalizers. This enables the
recording-channel designer to partition the
equalization more optimally between the write and read
sides. The principal benefit of write equalization is
that the read-flux-amplitude differences between high
and low densities are significantly reduced. This
permits maximum use of the linear operating region of
the magnetoresistive read head.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media)",
classification = "721; 722",
corpsource = "IBM Div. of Gen. Products, Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data recording; data storage, magnetic; equalisers;
equalization; head; HF boost; high-density recording;
linear operating region; linear transfer function;
magnetic; magnetic recording; magnetic-;
magnetoresistive read; Performance; read side;
recording channel; tape storage; transfer functions;
write; write current; write equalization; write side",
treatment = "P Practical",
}
@Article{Carnevali:1985:IPS,
author = "P. Carnevali and L. Coletti and S. Patarnello",
title = "Image Processing by Simulated Annealing",
journal = j-IBM-JRD,
volume = "29",
number = "6",
pages = "569--579",
month = nov,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "It is shown that simulated annealing, a statistical
mechanics method recently proposed as a tool in solving
complex optimization problems, can be used in problems
arising in image processing. The problems examined are
the estimation of the parameters necessary to describe
a geometrical pattern corrupted by noise, the smoothing
of bi-level images, and the process of halftoning a
continuous-level image. The analogy between the system
to be optimized and an equivalent physical system,
whose ground state is sought, is put forward by showing
that some of these problems are formally equivalent to
ground state problems for two-dimensional Ising spin
systems. In the case of low snr's, the methods proposed
give better results than those obtained with standard
techniques.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition)",
classification = "723; 741",
corpsource = "IBM Italy, Sci. Center, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bi-level images; bilevel image smoothing; complex;
continuous-level image; corruption; geometrical;
geometrical pattern; halftoning; Image Analysis; image
processing; noise; optimisation; optimization problems;
parameter estimation; pattern; picture processing;
simulated annealing; simulation; statistical mechanics;
statistical mechanics method",
treatment = "T Theoretical or Mathematical",
}
@Article{Bates:1985:JAT,
author = "R. J. S. Bates and L. A. Sauer",
title = "Jitter Accommodation in Token-Passing Ring {LANs}",
journal = j-IBM-JRD,
volume = "29",
number = "6",
pages = "580--587",
month = nov,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a token-passing ring Local Area Network (LAN) each
message accumulates phase jitter as it travels around
the ring. Unlike typical digital transmission systems,
which tend to have random data traffic, ring systems
carrying computer-generated traffic may have long
strings of repetitive-pattern data. This traffic
produces a jitter amplitude which is a function of the
message statistics and the transmission characteristics
of the physical layer. For the system to be stable,
this jitter must be controlled. This paper describes
the repetitive-pattern jitter generation and
accumulation process and gives a methodology for
designing the physical layer components to accommodate
it.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620L (Local area
networks)",
classification = "716; 717; 718; 723",
corpsource = "IBM Div. of Res., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accumulation process; characteristics; computer
networks; computer-generated traffic; data
communication; data communication systems; digital
communication systems; digital transmission systems;
IEEE 802.5 standard; interference (signal); jitter
accommodation; LAN; local area network; local area
networks; Local Networks; message statistics; phase
jitter; physical layer components design;
repetitive-pattern jitter generation; ring LANs;
systems; token-passing; token-passing ring;
transmission",
treatment = "P Practical; T Theoretical or Mathematical; X
Experimental",
}
@Article{Matino:1985:AHC,
author = "Haruhiro Matino",
title = "Analysis of the Holding Current in {CMOS} Latch-Up",
journal = j-IBM-JRD,
volume = "29",
number = "6",
pages = "588--592",
month = nov,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The holding current in CMOS latch-up with or without
well and\slash or substrate bias has been examined.
Measurements indicate that the holding current
increases significantly with reverse bias and low
shunting base resistance. It is shown that a previous
equation for the holding current is inaccurate, and a
new equation for holding current with bias is
presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits)",
classification = "713; 714",
corpsource = "IBM Japan Ltd., Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Analysis; CMOS integrated circuits; CMOS latch-up;
holding current; integrated circuits; low shunting base
resistance; monolithic IC; reverse bias; semiconductor
devices, MOS",
treatment = "X Experimental",
}
@Article{Hosler:1985:DPS,
author = "W. H{\"o}sler and R. J. Behm and E. Ritter",
title = "Defects on the {Pt(100)} Surface and their Influence
on Surface Reactions --- a Scanning Tunneling
Microscopy Study",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "403--410",
month = jul,
year = "1985",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 13 12:46:56 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Structural differences between a clean, reconstructed
Pt(100) surface and one exhibiting chemical or
structural irregularities have been identified by means
of a scanning tunneling microscope. The
(temperature-dependent) defect structure of a surface
which had undergone a phase transition involving mass
transport was characterized and compared to results
obtained using other techniques. The catalytic activity
of surface step sites was probed by the thermal
decomposition of ethylene. The resulting surface
roughening and buildup of carbon, which could be
resolved in STM images, showed that the decomposition
proceeds from terrace edges.",
acknowledgement = ack-nhfb,
affiliation = "Univ of Munich, Munich, West Ger",
affiliationaddress = "Univ of Munich, Munich, West Ger",
ajournal = "IBM J. Res. Develop.",
classification = "513; 547; 741; 804; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "catalytic activity; design; ethylene; mass transport;
measurement; Microscopic Examination; platinum and
alloys; scanning tunneling microscopy study; surface
reactions; thermal decomposition",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Physics \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Engineering",
}
@Article{Walker:1986:KSP,
author = "Adrian Walker",
title = "Knowledge systems: Principles and practice",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "2--13",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We describe what is expected of a knowledge-based
expert system, and the components from which such a
system is constructed. We give a view of how an
interplay between principles and practice has helped
the knowledge system field to develop, and give simple
examples to show that reasoning techniques based on
formal logic provide a useful coupling between
scientific and engineering work in the field. The
examples are about logic programming, knowledge
representation, judgmental reasoning, and about three
methods by which a system can acquire the knowledge it
needs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6170 (Expert systems); C7000 (Computer
applications)",
classification = "721; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "artificial intelligence; computer metatheory ---
Formal Logic; design; Expert Systems; expert systems;
formal logic; judgmental reasoning; knowledge
representation; knowledge system; knowledge systems;
knowledge-based expert system; languages; logic
programming; principles; reasoning techniques",
subject = "I.2.0 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, General",
treatment = "B Bibliography; P Practical",
}
@Article{Ennis:1986:CRE,
author = "R. L. Ennis and J. H. Griesmer and S. J. Hong and M.
Karnaugh and J. K. Kastner and D. A. Klein and K. R.
Milliken and M. I. Schor and H. M. {Van Woerkom}",
title = "A continuous real-time expert system for computer
operations",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "14--28",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Yorktown Expert System\slash MVS Manager (or
YES\slash MVS for short) is a continuous real-time
expert system that exerts active control over a
computing system and provides advice to computer
operators. YES\slash MVS provides advice on routine
operations and detects, diagnoses, and responds to
problems in the computer operator's domain. This paper
discusses the YES\slash MVS system, its domain
application, and issues that arise in the design and
development of an expert system that runs continuously
in real time.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7430 (Computer engineering)",
classification = "722; 723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "artificial intelligence; computer operating
procedures; computer operating systems; computer
operations; computer operators; design; development;
Expert System; expert systems; Expert Systems;
languages; LISP; management; real-time; real-time
expert system; systems; YES/MVS; Yorktown",
subject = "I.2.m Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Miscellaneous \\ H.4.2 Information
Systems, INFORMATION SYSTEMS APPLICATIONS, Types of
Systems, Decision support \\ I.2.5 Computing
Methodologies, ARTIFICIAL INTELLIGENCE, Programming
Languages and Software, OPS5 \\ C.3 Computer Systems
Organization, SPECIAL-PURPOSE AND APPLICATION-BASED
SYSTEMS, Real-time systems",
treatment = "A Application; P Practical",
}
@Article{Hirsch:1986:IKB,
author = "P. Hirsch and W. Katke and M. Meier and S. Snyder and
R. Stillman",
title = "Interfaces for Knowledge-Base Builders' Control
Knowledge and Application-Specific Procedures",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "29--38",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Expert System Environment\slash VM is an expert system
shell --- a general-purpose system for constructing and
executing expert system applications. An application
expert has both factual knowledge about an application
and knowledge about how that factual knowledge should
be organized and processed. Many applications require
application-dependent procedures to access databases or
to do specialized processing. An important and novel
part of Expert System Environment\slash VM is the
technique used to allow the expert or knowledge-base
builder to enter the control knowledge and to interface
with application-dependent procedures. This paper
discusses these high-level interfaces for the
knowledge-base builder.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6170 (Expert systems); C7000 (Computer
applications)",
classification = "721; 722; 723",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "application expert; application-dependent procedures;
artificial intelligence; computer interfaces; design;
ESCE/VM; ESDE/VM; Expert System Environment/VM; expert
systems; Expert Systems; factual knowledge; general-;
high level; high-level interfaces; interfaces;
knowledge-base builder; LISP; purpose system",
subject = "I.2.m Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Miscellaneous \\ H.1.2 Information
Systems, MODELS AND PRINCIPLES, User/Machine Systems",
treatment = "A Application; P Practical",
}
@Article{Guenthner:1986:TRK,
author = "Franz G{\"u}nthner and Hubert Lehmann and Wolfgang
Sch{\"o}nfeld",
title = "A theory for the representation of knowledge",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "39--56",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "How to represent knowledge is one of the key questions
in the construction of expert systems. Its solution
depends on a number of factors, the most important of
which are how knowledge is to be acquired and how it is
to be used. Since we are interested in the use of
natural language for communication with computers, we
require from a formalism suggested for knowledge
representation that it be suitable as a target for the
systematic translation from natural language
expressions. We propose a theory, called Discourse
Representation Theory (DRT), originally developed by
Kamp to analyze natural language discourse, as a means
to represent knowledge in an expert system. With DRT it
has been possible to solve certain cases of contextual
relations which have puzzled linguists and logicians
for a long time. We give a definition of DRT and
describe the rules used to translate from natural
language to Discourse Representation Structures (DRSs),
the central notion of the theory.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1230 (Artificial intelligence); C4210 (Formal logic);
C4290 (Other computer theory); C6170 (Expert systems)",
classification = "721; 723",
corpsource = "T{\"u}bingen Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; artificial intelligence; automata theory;
computational linguistics; computer metatheory;
context-sensitive languages; deductive theory; design;
discourse representation; discourse representation
structures; discourse representation theory; expert
system; Expert Systems; expert systems; formal logic;
knowledge engineering; knowledge representation;
language; languages; natural; natural language;
predicate logic; structures; theory",
subject = "I.2.4 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Knowledge Representation Formalisms and
Methods, Representations (procedural and rule-based)
\\
I.2.1 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
Applications and Expert Systems, Natural language
interfaces \\ I.2.3 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Deduction and Theorem Proving,
Deduction",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Buettiker:1986:TTT,
author = "Markus Buettiker and Rolf Landauer",
title = "Traversal Time for Tunneling",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "45l-454",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Tunneling of carriers through a barrier is
characterized not only by a transmission and reflection
probability, but also by the time it takes a carrier to
traverse the barrier. Recent work which discusses the
traversal time is summarized, and its relevance is
highlighted by discussing several tunneling
phenomena.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classification = "714; 931; 933",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "quantum theory; semiconductor devices; traversal time;
Tunneling",
}
@Article{Sowa:1986:ISI,
author = "John F. Sowa and Eileen C. Way",
title = "Implementing a Semantic Interpreter Using Conceptual
Graphs",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "57--69",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A parse applies grammar rules to generate a parse that
shows the syntactic structure of a sentence. This paper
describes a semantic interpreter that starts with a
parse tree and generates conceptual graphs that
represent the meaning of the sentence. To generate
conceptual graphs, the interpreter joins canonical
graphs associated with each word of input. The result
is a large graph that represents the entire sentence.
During the interpretation, the parse tree serves as a
guide to show how the graphs are joined. Both the
front-end parser and the back-end semantic interpreter
are written in the Programming Language for Natural
Language Processing (PLNLP). (Auhtor abstract)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1160 (Combinatorial mathematics); C4210 (Formal
logic); C6150C (Compilers, interpreters and other
processors)",
classification = "721; 723",
corpsource = "IBM Syst. Res. Inst., Thornwood, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(mathematics); artificial intelligence; automata
theory; canonical graphs; computer metatheory;
conceptual graphs; design; front-end parser; grammar
rules; Grammars; grammars; interpreter; languages;
natural language processing; natural languages; parse
tree; program interpreters; semantic; semantic
interpreter; sentence; syntactic structure; theory;
trees; word",
subject = "G.2.2 Mathematics of Computing, DISCRETE MATHEMATICS,
Graph Theory \\ I.2.1 Computing Methodologies,
ARTIFICIAL INTELLIGENCE, Applications and Expert
Systems, Natural language interfaces \\ F.4.2 Theory of
Computation, MATHEMATICAL LOGIC AND FORMAL LANGUAGES,
Grammars and Other Rewriting Systems, Parsing \\ D.3.4
Software, PROGRAMMING LANGUAGES, Processors,
Interpreters",
treatment = "T Theoretical or Mathematical",
}
@Article{Fargues:1986:CGS,
author = "Jean Fargues and Marie-Claude Landau and Anne Dugourd
and Laurent Catach",
title = "Conceptual Graphs for Semantics and Knowledge
Processing",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "70--79",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses the representational and
algorithmic power of the conceptual graph model for
natural language semantics and knowledge processing.
Also described is a Prolog-like resolution method for
conceptual graphs, which allows one to perform
deduction on large semantic domains. The interpreter
developed is similar to a Prolog interpreter in which
the terms are any conceptual graphs and in which the
unification algorithm is replaced by a specialized
algorithm for conceptual graphs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1160 (Combinatorial mathematics); C4210 (Formal
logic); C4240 (Programming and algorithm theory);
C6150C (Compilers, interpreters and other processors)",
classification = "721; 723",
corpsource = "IBM France, Sci. Center, Paris, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm theory; algorithmic power; algorithms;
artificial intelligence; automata theory; computer
metatheory; conceptual graph; conceptual graphs;
design; engineering; grammars; Grammars; graph theory;
interpreter; knowledge; knowledge processing;
languages; method; natural language; natural languages;
program interpreters; Prolog-like resolution;
PROLOG-like resolution; semantics; theory",
subject = "I.2.4 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Knowledge Representation Formalisms and
Methods \\ F.3.2 Theory of Computation, LOGICS AND
MEANINGS OF PROGRAMS, Semantics of Programming
Languages \\ G.2.2 Mathematics of Computing, DISCRETE
MATHEMATICS, Graph Theory \\ D.3.4 Software,
PROGRAMMING LANGUAGES, Processors, Interpreters",
treatment = "T Theoretical or Mathematical",
}
@Article{vanEmdeBoas:1986:SEH,
author = "Chica {van Emde Boas} and Peter {van Emde Boas}",
title = "Storing and evaluating {Horn}-clause rules in a
relational database",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "80--92",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a practical approach to storing
and evaluating Horn-clause rules in a relational
database system. The intention is to give an outline of
what needs to be added to an existing relational
database system to allow it to support full logic
programming functions. Implementation issues for each
new function are discussed. We show how Horn-clause
rules can be translated into database commands without
recourse to semantics and how their evaluation can be
performed in the database itself. This brings the
complete logic programming environment within reach of
the database management system, allowing data and rule
sharing, concurrency control, recovery procedures,
etc., to be used. New is that the complete logic
programming environment is incorporated into the
database system. IBM Business System 12, extended in
this way, may be a suitable vehicle for expert system
applications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C4250 (Database theory); C6115
(Programming support); C6160D (Relational databases)",
classification = "721; 723",
corpsource = "IBM Inf. Network Services, Support Center Uithoorn,
Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "artificial intelligence --- Expert Systems; computer
metatheory; concurrency control; data sharing; database
commands; database management system; database systems;
database theory; design; environments; Horn-clause
rules; horn-clause rules; languages; logic; logic
programming; programming; recovery procedures;
Relational; relational database; relational databases;
rule sharing; theory",
subject = "H.2.m Information Systems, DATABASE MANAGEMENT,
Miscellaneous \\ F.4.1 Theory of Computation,
MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Mathematical
Logic, Logic programming \\ I.2.3 Computing
Methodologies, ARTIFICIAL INTELLIGENCE, Deduction and
Theorem Proving, Logic programming",
treatment = "T Theoretical or Mathematical",
}
@Article{Eddy:1986:SRB,
author = "William F. Eddy and Gabriel P. Pei",
title = "Structures of Rule-Based Belief Functions",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "93--101",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Shafer's theory of evidential reasoning has recently
received attention as a possible model for
probabilistic reasoning in expert system applications.
This paper discusses the difficulties of implementing
Shafer's belief functions in the context of the most
common form of expert system, rule-based systems. Two
most important problems are: the representation of the
expert's subjective degrees of belief corresponding to
his expressed rules, and the computational complexity
of the inference mechanism for combining evidence. We
argue that a potential approach for dealing with both
problems is given by introducing constraints on the
structure of the belief functions. These constraints,
along with the expressed rules and the elicited belief
values, form the expert's total knowledge.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C4290 (Other computer theory);
C6170 (Expert systems); C7000 (Computer applications)",
classification = "721; 723",
corpsource = "Carnegie-Mellon Univ., Pittsburg, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "artificial intelligence; belief functions;
computational complexity; computer metatheory; design;
evidential reasoning; expert system; Expert Systems;
expert systems; expert's; formal logic; inference
mechanism; probabilistic reasoning; probability;
reasoning; rule-based systems; Shafer's belief
functions; structural constraints; theory; total
knowledge",
subject = "I.2.4 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Knowledge Representation Formalisms and
Methods, Representations (procedural and rule-based)
\\
I.2.3 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
Deduction and Theorem Proving, Uncertainty, ``fuzzy,''
and probabilistic reasoning",
treatment = "T Theoretical or Mathematical",
}
@Article{Diel:1986:ECA,
author = "H. Diel and N. Lenz and H. M. Welsch",
title = "An Experimental Computer Architecture Supporting
Expert Systems and Logic Programming",
journal = j-IBM-JRD,
volume = "30",
number = "1",
pages = "102--111",
month = jan,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a set of function primitives
which have been designed for support of expert systems
and logic programs. The functions could be offered as
part of the computer architecture by implementing them
in microcode and partially in hardware. The functions
are primarily oriented towards support of logic
programming languages such as Prolog for implementing
expert systems. Emphasis is given to supporting the
parallel execution of expert system applications by
multiple processors. The concepts are based on the
Concurrent Data Access Architecture (CDAA). It is shown
that OR-parallelism, as well as AND-parallelism, can be
supported.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5440 (Multiprocessing
systems); C6110 (Systems analysis and programming);
C6170 (Expert systems); C7000 (Computer applications)",
classification = "721; 722; 723",
corpsource = "IBM Germany, Boblingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "AND-; artificial intelligence; computer architecture;
computer programming languages; concurrent data access
architecture; design; experimentation; expert systems;
Expert Systems; function primitives; logic programming;
microcode; multiple processors; OR-parallelism;
parallel processing; parallelism; PROLOG; Prolog;
theory",
subject = "I.2.3 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Deduction and Theorem Proving, Logic
programming \\ F.4.1 Theory of Computation,
MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Mathematical
Logic, Logic programming \\ F.3.3 Theory of
Computation, LOGICS AND MEANINGS OF PROGRAMS, Studies
of Program Constructs \\ F.1.2 Theory of Computation,
COMPUTATION BY ABSTRACT DEVICES, Modes of Computation,
Parallelism",
treatment = "X Experimental",
}
@Article{Agarwal:1986:NSV,
author = "Ramesh C. Agarwal and James W. Cooley and Fred G.
Gustavson and James B. Shearer and Gordon Slishman and
Bryant Tuckerman",
title = "New Scalar and Vector Elementary Functions for the
{IBM System\slash 370}",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "126--144",
month = mar,
year = "1986",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.302.0126",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76W05",
MRnumber = "840 341",
bibdate = "Sat Jan 11 17:44:01 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/elefunt.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "See clarification \cite{Agarwal:1987:CNS}.",
abstract = "Algorithms have been developed to compute short-and
long-precision elementary functions: SIN, COS, TAN,
COTAN, LOG, LOG10, EXP, POWER, SQRT, ATAN, ASIN, ACOS,
ATAN2, and CABS, in scalar (28 functions) and vector
(22 functions) mode. They have been implemented as part
of the new VS FORTRAN library recently announced along
with the IBM 3090 Vector Facility. These algorithms are
essentially table-based algorithms. An important
feature of these algorithms is that they produce
bitwise-identical results on scalar and vector
System\slash 370 machines. Of these, for five functions
the computed value result is always the correctly
rounded value of the infinite-precision result. For the
rest of the functions, the value returned is one of the
two floating-point neighbors bordering the
infinite-precision result, which implies exact results
if they are machine-representable. For the five
correctly rounded elementary functions, scalar and
vector algorithms are designed independently to
optimize performance in each case.",
accepted = "2 December 1985",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C7310 (Mathematics
computing)",
classification = "723",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "ACOS; Algorithms; algorithms; ASIN; ATAN; ATAN2;
bitwise-identical results; CABS; computer metatheory;
computer programming; computer programming languages
--- fortran; COS; COTAN; design; elementary functions;
EXP; FORTRAN; fortran library; functions; IBM
computers; IBM System/370; infinite-precision result;
LOG; LOG10; mainframes; measurement; performance;
POWER; scalar elementary functions; SIN; SQRT;
subroutines; table-based algorithms; TAN; vector
elementary; VS FORTRAN library",
received = "5 November 1985",
remark-1 = "Numerous figures show errors in ulps, in either linear
or logarithmic scales, as dot plots over a range of
arguments, an idea that the authors credit to a
suggestion by Cleve Moler, then consulting with IBM
Palo Alto labs; such plots are used extensively in
\cite{Beebe:2017:MFC}.",
remark-2 = "From pages 128--129: ``A great deal of satisfaction
was obtained from the fact that five of the intrinsic
functions reported here always deliver correctly
rounded results; these are SQRT, DSQRT, CABS, CDABS,
and EXP. One important aspect of this is that correctly
rounded results were obtained with surprisingly little
sacrifice in performance.''",
remark-3 = "From page 132: ``Our CABS and CDABS functions satisfy
$\e/u < 0.5$ (this can also be called a half-ulp
criterion). They have best-possible rounding, except
that unavoidably there are cases when $| e/u | = 0.5$,
in which case it would be equally correct to round
downward or upward; we choose to round upward. This is
consistent with the System/370 definition of
rounding.''",
remark-4 = "From pages 134--135: ``Tuckerman's condition is of
historic significance, as its use allowed us to produce
IBM's first elementary function that delivered
correctly rounded results for all arguments.''",
remark-5 = "From page 137: ``X**2.0 usually produces a correctly
rounded value, while X*X always produces the truncated
value of $X^2$ .''",
remark-6 = "From page 139: ``Generating precise times is
difficult, since seemingly inconsequential changes in
the timing procedure may have a noticeable effect on
the measured times. For example, on the 3081KX the
performance of the STM [store multiple] and LM [load
multiple] instructions is severely degraded near page
boundaries. This means that in the rare event that the
save area of a subroutine is near a page boundary, the
speed of execution of the subroutine will be
substantially decreased.''",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ I.1.2 Computing Methodologies, ALGEBRAIC
MANIPULATION, Algorithms \\ F.3.3 Theory of
Computation, LOGICS AND MEANINGS OF PROGRAMS, Studies
of Program Constructs, Functional constructs \\ C.1.2
Computer Systems Organization, PROCESSOR ARCHITECTURES,
Multiple Data Stream Architectures (Multiprocessors),
Array and vector processors",
treatment = "N New Development; P Practical",
}
@Article{Agarwal:1986:FTC,
author = "Ramesh C. Agarwal and James W. Cooley",
title = "{Fourier} Transform and Convolution Subroutines for
the {IBM 3090} {Vector Facility}",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "145--162",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65W05 (65T05 94A11)",
MRnumber = "840 342",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A set of highly optimized subroutines for digital
signal processing has been included in the Engineering
and Scientific Subroutine Library (ESSL) for the IBM
3090 Vector Facility. These include FORTRAN-callable
subroutines for Fourier transforms, convolution, and
correlation. The subroutines are designed and tuned for
optimal vector and cache performance. Speedups of up to
9 one-half times over scalar performance on the 3090
have been obtained.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260 (Digital signal processing); C6140D (High level
languages)",
classification = "723; 921",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; cache performance; computer metatheory;
computer programming; computerised signal processing;
convolution; convolution subroutines; correlation;
design; digital signal processing; Facility; FORTRAN;
FORTRAN-callable; fortran-callable subroutines; Fourier
transform; Fourier transforms; IBM 3090; IBM 3090
Vector; IBM computers; mathematical transformations ---
Fourier Transforms; measurement; performance;
Subroutines; subroutines; theory; vector and cache
performance; vector facility",
subject = "D.3.3 Software, PROGRAMMING LANGUAGES, Language
Constructs, Procedures, functions, and subroutines \\
C.3 Computer Systems Organization, SPECIAL-PURPOSE AND
APPLICATION-BASED SYSTEMS, Signal processing systems
\\
I.5.4 Computing Methodologies, PATTERN RECOGNITION,
Applications, Signal processing \\ F.1.2 Theory of
Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
Computation, Alternation and nondeterminism",
treatment = "P Practical",
}
@Article{Scarborough:1986:VFC,
author = "Randolph G. Scarborough and Harwood G. Kolsky",
title = "A vectorizing {Fortran} compiler",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "163--171",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65W05",
MRnumber = "840 343",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a vectorizing Fortran compiler
for the IBM 3090 Vector Facility. Opportunities for
vectorization are investigated for eight levels of
DO-loop nesting. Recurrences in inner loops do not
prevent vectorization of outer loops. A least-cost
analysis determines from the opportunities identified
which specific vectorization will result in the fastest
execution. The normal optimization phases of the
compiler produce much of the information needed for the
vectorization analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "722; 723; 921",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer operating systems; computer programming
languages --- fortran; design; DO-; do-loop nesting;
FORTRAN; fortran compiler; IBM 3090 Vector Facility;
inner loops; languages; least-cost analysis; loop
nesting; mathematical techniques --- Vectors;
optimization phases; program compilers; Program
Compilers; vectorization; vectorizing Fortran
compiler",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, FORTRAN \\ D.3.4 Software, PROGRAMMING
LANGUAGES, Processors, Compilers",
treatment = "P Practical",
}
@Article{Gazdag:1986:SMI,
author = "J. Gazdag and G. Radicati and P. Sguazzero and H. H.
Wang",
title = "Seismic Migration on the {IBM 3090} {Vector
Facility}",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "172--183",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Seismic prospecting aims at determining the structure
of the earth from indirect measurements. Acoustic wave
fields are generated at the surface, penetrate the
earth, and are backscattered by the earth's
inhomogeneities. The data recorded at the surface are
processed in a complex sequence of steps among which is
seismic migration. This is a wave depropagation process
that permits the localization in depth of the origin of
the diffraction events measured at the surface. This
paper presents an overview of the major wave-equation
migration methods. The most frequently executed
algorithms or kernels on which the execution speed
depends most crucially are given attention. The speedup
resulting from scalar-to-vector formulation is
presented over wide ranges of dimensionality for linear
tridiagonal equation solvers, Fourier transforms, and
convolution operations. The vectorizability and
resulting speedup are also addressed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A9130R (Controlled source seismology); A9385
(Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B7710
(Geophysical techniques and equipment); C7340
(Geophysics computing)",
classification = "481; 484; 723",
corpsource = "IBM Sci., Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3090 Vector Facility; acoustic wave fields;
algorithms; computing; concurrent processing;
convolution operations; depropagation; design;
diffraction events; equation migration methods;
exploration; Fourier domain; Fourier Transforms;
geophysical prospecting; geophysical techniques;
geophysics; geophysics computing; IBM 3090 Vector
Facility; IBM 3090 vector facility; localization;
measurement; multilevel; Multitasking Facility;
parallelism; performance; scalar-to-vector formulation;
Seismic; seismic migration; seismic prospecting;
seismology; seismology --- Computer Applications;
theory; tridiagonal equation solvers; wave; wave
depropagation; wave-; wave-equation migration",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Earth and atmospheric sciences \\ C.1.2
Computer Systems Organization, PROCESSOR ARCHITECTURES,
Multiple Data Stream Architectures (Multiprocessors),
Array and vector processors",
treatment = "X Experimental",
}
@Article{Efrat:1986:PIL,
author = "Ilan Efrat and Miron Tismenetsky",
title = "Parallel Iterative Linear Solvers for Oil Reservoir
Models",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "184--192",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65W05 (65F10 76S05)",
MRnumber = "840 344",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper suggests a new algorithm for solving sparse
linear systems which is readily parallelized and is
efficient for matrices arising in such domains as
reservoir modeling. The algorithm is a variant of the
incomplete block factorization technique, accelerated
by biconjugate gradient iterations or by another
acceleration method. Implementation on a vector
computer such as the IBM 3090 Vector Facility is
described. We suggest some refinements of known
preconditioning methods enabling their parallel
computation. Numerical experiments are presented to
display the performance of the suggested methods.
Attention is given to fully implicit, multiphase models
which yield asymmetrical systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering computing)",
classification = "441; 512; 723",
corpsource = "IBM Israel, Sci. Center, Haifa, Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Biconjugate Gradient; block factorization;
block factorization technique; civil engineering
computing; computer simulation --- Applications;
design; experimentation; FORTRAN; IBM 3090 Vector
Facility; incomplete; iterations; iterative linear
solvers; iterative methods; Mathematical Models; matrix
algebra; measurement; multiphase models; oil reservoir;
oil reservoir models; preconditioning methods;
reservoirs; sparse linear systems; theory; vector
computer",
subject = "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Modes of Computation, Parallelism \\ G.1.0
Mathematics of Computing, NUMERICAL ANALYSIS, General,
Parallel algorithms \\ G.1.3 Mathematics of Computing,
NUMERICAL ANALYSIS, Numerical Linear Algebra, Linear
systems (direct and iterative methods)",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Martin:1986:MCP,
author = "William R. Martin and Paul F. Nowak and James A.
Rathkopf",
title = "{Monte Carlo} Photon Transport on a Vector
Supercomputer",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "193--202",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of `event-based' algorithms for particle
transport Monte Carlo methods has allowed the
successful adaptation of these methods to vector
supercomputers. An alternative algorithm for the
specific application of photon transport in an
axisymmetric inertially confined fusion plasma has been
developed and implemented on a vector supercomputer.
The new algorithm is described; its unique features are
discussed and compared with existing vectorized
algorithms for Monte Carlo. Numerical results are
presented illustrating its efficiency on a vector
supercomputer, relative to an optimized scalar Monte
Carlo algorithm that was developed for this purpose.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A5225F (Plasma transport properties); A5265 (Plasma
simulation); C7320 (Physics and chemistry computing)",
classification = "722; 723; 921; 922; 932",
corpsource = "Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "'event-based' algorithms; axisymmetric inertially
confined fusion plasma; computer systems, digital ---
Applications; mathematical techniques --- Algorithms;
Monte Carlo methods; monte carlo methods; Monte Carlo
photon transport; particle; photon transport; photons;
physics computing; plasma simulation; plasma transport
processes; supercomputer; transport; Transport
Properties; vector supercomputer; vectorized
algorithms",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Bradshaw:1986:CMP,
author = "R. Bradshaw and B. Bhushan and C. Kalthoff and M.
Warne",
title = "Chemical and Mechanical Performance of Flexible
Magnetic Tape Containing Chromium Dioxide",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "203--216",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The development of a magnetic-recording tape using
chromium dioxide suitable for use with the tape drive
of the IBM 3480 Magnetic Tape Subsystem was found to
require optimization of the chemical and mechanical
properties of the coating. This paper discusses the
role of chromium dioxide in the oxidative and
hydrolytic degradation of the polyesterpolyurethane
binders used in most flexible tape coatings, and the
subsequent necessity for binder selection to eliminate
these degradative effects. In addition to the chemical
behavior, the paper discusses the role of the
interaction of the chromium dioxide with the binder
necessary to obtain mechanical performance suitable for
the 3480 tape drive. A high modulus and a relatively
high glass-transition temperature were found to be
required to avoid changes in the frictional properties
of the tape.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording)",
classification = "539; 543; 704; 721; 722",
corpsource = "IBM General Products Div., Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3480 tape drive; chemical properties; chromium
compounds; chromium compounds --- Physical Properties;
chromium dioxide; coating techniques; CrO$_2$; data
storage, magnetic; design; flexible magnetic; flexible
magnetic tape; hydrolytic degradation; IBM 3480
Magnetic Tape; magnetic tapes; magnetic-recording tape;
measurement; mechanical properties; performance;
polyester-polyurethane binders; Subsystem; Tape; tape
drive",
subject = "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS",
treatment = "N New Development; P Practical; X Experimental",
}
@Article{Anonymous:1986:RPI,
author = "Anonymous",
title = "Recent papers by {IBM} authors",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "217--226",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:58:06 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1986:RIP,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "30",
number = "2",
pages = "227--228",
month = mar,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:27:11 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Easton:1986:KDS,
author = "Malcolm C. Easton",
title = "Key-Sequence Data Sets on Indelible Storage",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "230--241",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Methods for creating and maintaining key-sequence data
sets without overwriting the storage medium are
described. These methods may be applied to erasable or
to write-once storage devices, and they are compatible
with conventional device error-management techniques.
All past values of data records are preserved in a data
structure called a Write-Once B-Tree. Rapid random
access is available to records by key value; rapid
sequential access is available to records in
key-sequence order. Queries requesting data as of a
previous time are processed as rapidly as requests for
current data. Access time is proportional to the
logarithm of the number of current records in the
database. Efficient methods for inserting, updating,
and deleting records are described. Upper bounds for
tree depth and for storage consumption are given and
compared with results from simulation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6160 (Database management
systems (DBMS))",
classification = "721; 722; 723",
corpsource = "Res. Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "access time; bounds for tree depth; data processing;
data sets; data storage, digital; data structure; data
structures; database management systems; database
systems; DBMS; deleting; design; devices; erasable
storage; error-management; indelible databases;
indelible storage; key-sequence data; key-sequence data
sets; key-sequence order; KSDS; magnetic disc; magnetic
disc storage; maintenance; management; measurement;
optical disc storage; overwriting avoidance;
performance; Performance; rapid; rapid random access;
records; records insertion; sequential access; sets;
storage; storage consumption; techniques; tree depth;
updating; Write-Once B-Tree; write-once b-tree;
write-once storage devices",
subject = "H.2.m Information Systems, DATABASE MANAGEMENT,
Miscellaneous \\ E.4 Data, CODING AND INFORMATION
THEORY, Data compaction and compression",
treatment = "G General Review",
}
@Article{Stone:1986:ACD,
author = "Harold S. Stone and Paolo Sipala",
title = "The average complexity of depth-first search with
backtracking and cutoff",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "242--258",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "636.68041",
abstract = "This paper analyzes two algorithms for depth-first
search of binary trees. The first algorithm uses a
search strategy that terminates the search when a
successful leaf is reached. The algorithm does not use
internal cutoff to restrict the search space. If N is
the depth of the tree, then the average number of nodes
visited by the algorithm is as low as O(N) and as high
as O(2**N) depending only on the value of the
probability parameter that characterizes the search.
The second search algorithm uses backtracking with
cutoff. A decision to cut off the search at a node
eliminates the entire subtree below that node from
further consideration. The result for this algorithm is
that the average number of nodes visited grows linearly
in the depth of the tree, regardless of the cutoff
probability. If the cutoff probability is high, the
search has a high probability of failing without
examining much of the tree. If the cutoff probability
is low, the search has a high probability of succeeding
on the leftmost path of the tree without performing
extensive backtracking.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1160 (Combinatorial mathematics); C4240 (Programming
and algorithm theory)",
classification = "723; 921; 922",
corpsource = "Div. of Res., IBM Thomas J. Watson Res. Center,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(mathematics); algorithm theory; algorithms;
Algorithms; algorithms; average complexity; average
number; backtracking; binary trees; computational
complexity; computer programming; cutoff; cutoff
probability; depth-first search; mathematical
techniques --- Trees; NP-complete problems; of nodes
visited; probability; search algorithm; search
algorithms; theory; trees",
subject = "I.2.8 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Problem Solving, Control Methods, and
Search, Graph and tree search strategies \\ I.2.8
Computing Methodologies, ARTIFICIAL INTELLIGENCE,
Problem Solving, Control Methods, and Search,
Backtracking \\ F.2.2 Theory of Computation, ANALYSIS
OF ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
Algorithms and Problems, Sorting and searching",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Patel:1986:FDM,
author = "Arvind M. Patel",
title = "On-The-Fly Decoder for Multiple Byte Errors",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "259--268",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Multiple-error-correcting Reed--Solomon on BCH codes
in GF(2**b) can be used for correction of multiple
burst errors in binary data. However, the relatively
long time required for decoding multiple errors has
been among the main objections to applying these
schemes to high-performance computer products. A
decoding procedure is developed for on-the-fly
correction of multiple symbol (byte) errors in
Reed--Solomon or BCH codes. A new decoder architecture
expands the concept of Chien search for error locations
into computation of error values as well, and creates a
synchronous procedure for complete on-the-fly error
correction of multiple byte errors. Forney's expression
for error values is simplified, which results in
economies in hardware and decoding time. All division
operations are eliminated from the computation of the
error-locator equation, and only one division operation
is required in the computation of error values. The
special cases of fewer errors are processed
automatically, using the corresponding smaller set of
syndromes through a single set of hardware. The
resultant decoder implementation is suited for LSI chip
design with pipelined data flow.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C5320K
(Optical storage)",
classification = "713; 714; 722; 723",
corpsource = "Gen. Products Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "BCH codes; binary data; byte errors; Chien search;
codes, symbolic; complete on-the-fly error correction
of multiple; computation of error values; computer
metatheory; correction of multiple burst errors in;
decoder architecture; decoder for; decoding; decoding
time reduction; design; Error Correction; error
correction codes; example; Forney's expression for
error values; hardware reduction; integrated circuits,
LSI --- Computer Aided Design; LSI chip design;
magnetic disc storage; magnetic tape storage; multiple
burst errors; multiple byte errors; multiple error
correcting codes; of error locations; optical disc
storage; performance; pipelined data flow; procedure;
Reed Solomon codes; Reed--Solomon codes; set of
syndromes; single set of hardware; smaller;
synchronous; theory; verification",
subject = "E.4 Data, CODING AND INFORMATION THEORY, Data
compaction and compression \\ B.5.m Hardware,
REGISTER-TRANSFER-LEVEL IMPLEMENTATION, Miscellaneous",
treatment = "T Theoretical or Mathematical",
xxauthor = "Arvind M. Patele",
xxpages = "259--269",
}
@Article{Cannon:1986:DPM,
author = "D. M. Cannon and W. R. Dempwolf and J. M. Schmalhorst
and F. B. Shelledy and R. D. Silkensen",
title = "Design and Performance of a Magnetic Head for a
High-Density Tape Drive",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "270--277",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The design of a magnetic head for use in the tape
drive portion of the IBM 3480 Magnetic Tape Subsystem
required that advances be made in track density and
linear recording density while meeting requirements for
signal quality, manufacturability, and reliability. The
design that was developed to fulfill these needs
combines ferrite pole-pieces, magnetorestrictive read
elements, and planar-deposited write turns. This paper
describes the read and write elements of the head and
the approach used in the selection of the design
parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering); B3120B
(Magnetic recording); C5320C (Storage on moving
magnetic media)",
classification = "704; 708; 721; 722",
corpsource = "Gen. Products. Div., IBM, Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "data storage, magnetic; density; deposited write
turns; design; design engineering; design parameters;
design tradeoffs; ferrite devices; ferrite pole-pieces;
half-inch tape; head; high-density tape drive; IBM
3480; linear recording; magnetic; magnetic head;
magnetic heads; magnetic tape equipment; magnetic tape
subsystem; magnetoresistive read elements;
manufacturability; measurement; performance; planar-;
read and write elements; recording density;
reliability; signal quality; Tape; tape drive portion;
track density; write elements",
subject = "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
Input/Output Devices \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS",
treatment = "P Practical; R Product Review; T Theoretical or
Mathematical; X Experimental",
}
@Article{Prisgrove:1986:SSP,
author = "Lindsay A. Prisgrove and Gerald S. Shedler",
title = "Symmetric stochastic {Petri} nets",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "278--293",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68Q90 (68U20)",
MRnumber = "844 913",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "636.68066",
abstract = "The stochastic Petri net (SPN) model is suited to
formal representation of concurrency, synchronization,
and communication. We focus on discrete event
simulation methods for SPN models with special
structure and define a symmetric SPN. Exploiting
properties of a symmetric SPN and underlying
regenerative process structure, we establish steady
state estimation procedures based on independent,
nonidentically distributed blocks of the marketing
process. We also establish estimation procedures for
passage times in the symmetric SPN setting. These
results lead to efficient estimation procedures for
delay\slash throughput characteristics of ring networks
with identical ports.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); C1160
(Combinatorial mathematics)",
classification = "722; 723; 922",
corpsource = "Dept. of Oper. Res., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer metatheory; computer systems, digital; delay
characteristics; directed graphs; discrete event;
discrete event simulation; Distributed; distributed
processing; estimation procedures; estimation
procedures for passage; identical ports; methods;
passage times; Petri nets; ports; regenerative process
structure; ring networks; ring networks with identical;
SPN; statistical methods; steady state; symmetrical
stochastic Petri nets; theory; throughput
characteristics; times; verification",
subject = "F.1.1 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Models of Computation, Unbounded-action
devices \\ I.6.m Computing Methodologies, SIMULATION
AND MODELING, Miscellaneous",
treatment = "T Theoretical or Mathematical",
}
@Article{Arbab:1986:CCA,
author = "Bijan Arbab",
title = "Compiling circular attribute grammars into {Prolog}",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "294--309",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an algorithm for compiling
attribute grammars into Prolog. The attribute grammars
may include inherited and synthesized attributes and
contain recursive (circular) definitions. The semantics
of the recursive definitions is defined in terms of a
fixed-point finding function. The generation Prolog
code stands in direct relation to its attribute
grammar, where logical variables play the role of
synthesized or inherited attributes. Thus an effective
method for the execution of recursive attribute
grammars has been defined and applied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "721; 723",
corpsource = "IBM Sci. Center, Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; algorithms; attribute grammars; attribute
grammars into Prolog; automata theory; circular
attribute grammars; compiling; computer metatheory;
computer programming languages; definitions; design;
execution of recursive attribute; fixed-point finding
function; Grammars; grammars; inherited attributes;
languages; program compilers; Prolog; PROLOG; Prolog
code; recursive; semantics; synthesized or inherited
attributes",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, Prolog \\ F.4.2 Theory of Computation,
MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Grammars and
Other Rewriting Systems, Grammar types \\ D.3.4
Software, PROGRAMMING LANGUAGES, Processors,
Compilers",
treatment = "P Practical",
}
@Article{Cioffi:1986:LSI,
author = "J. M. Cioffi",
title = "Least-Squares Storage-Channel Identification",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "310--320",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Pulse (dibit) and step (transition) responses for
magnetic-storage channels are important for
detection-circuitry design and for comparison of
various media, heads, and other channel components.
This paper presents a least-squares procedure that can
be used to identify the dibit and transition responses
from measurements of the read-head response to any
known data sequence written on the medium. The method
yields higher-quality estimates for the dibit and step
shapes than does determining these same characteristics
by measuring the average response to isolated
transition or by performing a Discrete Fourier
Transform (DFT) on the response to a pseudorandom data
pattern. The new method can be implemented off line but
also can be made sufficiently efficient to be
implemented with a microprocessor for use in
self-optimizing (adaptive) channel detection
circuitry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1220 (Simulation, modelling and identification);
C4130 (Interpolation and function approximation);
C5320C (Storage on moving magnetic media)",
classification = "721; 722; 723; 921",
corpsource = "Dept. of Electr. Eng., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "channel detection circuitry; circuitry design; data
sequence; data storage channels; data storage,
magnetic; design; detection-; dibit response; disc;
identification; least squares approximations; least
squares storage channel; least-squares procedure;
magnetic disc; magnetic tape storage; magnetic-storage
channels; mathematical techniques --- Least Squares
Approximations; measurement; Performance; pulse
response; read-head response; responses; self
optimising channel detection circuitry; step response;
storage; storage-channel identification; tape storage;
theory; transition",
subject = "G.3 Mathematics of Computing, PROBABILITY AND
STATISTICS \\ B.4.2 Hardware, INPUT/OUTPUT AND DATA
COMMUNICATIONS, Input/Output Devices, Channels and
controllers \\ B.3.m Hardware, MEMORY STRUCTURES,
Miscellaneous",
treatment = "T Theoretical or Mathematical",
}
@Article{Barbosa:1986:MSW,
author = "Lineu C. Barbosa",
title = "A maximum-energy-concentration spectral window",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "321--325",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A time-discrete solution method is proposed for
realization of a spectral window which is ideal from an
energy concentration viewpoint. This window is one that
concentrates the maximum amount of energy in a
specified bandwidth and hence provides optimal spectral
resolution.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); C1260
(Information theory)",
classification = "713; 716; 717; 718",
corpsource = "Res. Div., IBM, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "design; electric filters, digital; filtering and
prediction theory; maximum-energy-concentration;
maximum-energy-concentration spectral window; optimal
spectral resolution; signal filtering and prediction;
solution method; spectral window; Spectrum Analysis;
theory; time-discrete",
subject = "E.4 Data, CODING AND INFORMATION THEORY, Data
compaction and compression",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Stapper:1986:YFD,
author = "C. H. Stapper",
title = "On Yield, Fault Distributions, and Clustering of
Particles",
journal = j-IBM-JRD,
volume = "30",
number = "3",
pages = "326--338",
month = may,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Increasing the levels of semiconductor integration to
larger chips with more transistors causes the fault and
defect distributions of VLSI memory chips to deviate
increasingly further from simple random Poisson
statistics. The spatial distributions of particles on
semiconductor wafers have been analyzed to gain insight
into the nature of integrated circuit defect
statistics. The analysis was done using grids of
squares known as quadrats. It was found that the
cluster parameter, which until now has been treated as
a constant, did vary with quadrat area. The results
also show that the deviation from Poisson statistics
continues to increase into the realm of wafer-scale
integration or WSI. Computer simulations verify this
effect.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits)",
classification = "421; 713; 714; 922",
corpsource = "Gen. Technol. Div., IBM, Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cluster; clustering; computer simulations; defect
distributions; defect statistics; design; deviation
from Poisson statistics; Failure; fault distributions;
grids of squares; integrated circuit; integrated
circuit technology; integrated circuits, VLSI;
integrated memory circuits; measurement; memory chips;
of particles; parameter; performance; probability;
quadrat area; quadrats; semiconductor wafers; spatial
distributions of particles; statistical methods;
theory; VLSI; VLSI memory chips; wafer-scale
integration; WSI; yield",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ B.7.1 Hardware, INTEGRATED CIRCUITS, Types
and Design Styles, Advanced technologies \\ B.7.3
Hardware, INTEGRATED CIRCUITS, Reliability and
Testing",
treatment = "T Theoretical or Mathematical",
}
@Article{Anonymous:1986:STM,
author = "Anonymous",
title = "Scanning Tunneling Microscopy Workshop",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "355--430",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Nov 10 07:52:46 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Proceedings includes ten papers dealing with the
performance applications and features of the scanning
tunnel microscope (STM). This instrument is capable of
measuring the positions of individual surface atoms
with unprecedented three-dimensional resolution. It has
been used to measure vertical position differences as
small as 0.1A and a lateral resolution that is better
than 2A. Topics discussed include: biological
materials, metallic surfaces, spectroscopic analysis,
and electronic and atomic properties.",
abstract-2 = "Presented here is an overview of the present status
and future prospects of scanning tunneling microscopy.
Topics covered include the physical basis of the
scanning tunneling microscope, its instrumentation
aspects, and its use for structural and spectroscopic
imaging --- on a scale which extends to atomic
dimensions. Associated experimental and theoretical
studies are reviewed, including several which suggest
potential applicability of this new type of microscope
to a relatively broad range of biological, chemical,
and technological areas.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rueschlikon, Switz",
affiliationaddress = "IBM, Rueschlikon, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0130R (Reviews and tutorial papers; resource
letters); A0630C (Spatial variables measurement); A0780
(Electron and ion microscopes and techniques)",
classification = "531; 714; 741; 801; 933; 941",
conference = "Scanning Tunneling Microscopy Workshop, Oberlech",
corpsource = "Zurich Res. Lab., IBM Corp., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; aspects; atom transfer; atomic
dimensions; design; future prospects; imaging
techniques; instrumentation; measurement; metals and
alloys; microscopes; overview; present status; reviews;
scanning tunneling microscopy; scanning tunnelling
microscopy; semiconductor devices; semiconductor
materials; spectroscopic analysis; spectroscopic
analysis --- Imaging Techniques; spectroscopic imaging;
STM; structural imaging; surface science; surface
topography; surface topography measurement",
meetingaddress = "Oberlech, Austria",
meetingdate = "Jul 1985",
sponsor = "IBM Europe Inst",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering",
treatment = "B Bibliography; G General Review",
}
@Article{Hansma:1986:STJ,
author = "P. K. Hansma",
title = "Squeezable Tunneling Junctions",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "370--373",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Squeezable tunneling junctions establish the current
state of the art for resistance stability of
mechanically adjustable tunneling structures at DELTA
R/R approximately equals 0.1\%. This is sufficient for
use in connection with spectroscopies as subtle as
phonon spectroscopy, but it is marginal and cannot at
present be maintained to high enough bias voltage to
permit molecular vibrational spectroscopy. Squeezable
junctions have been used for characterizing bulk
samples and for differential capacitance-voltage
analyses of semiconductors.",
acknowledgement = ack-nhfb,
affiliation = "Univ of California, Santa Barbara, CA, USA",
affiliationaddress = "Univ of California, Santa Barbara, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0620H (Measurement standards and calibration); A0750
(Electrical instruments and techniques); A0780
(Electron and ion microscopes and techniques); A7340G
(Tunnelling: general)A7450 (Proximity effects,
tunnelling phenomena, and Josephson effect)",
classification = "701; 714",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "Dept. of Phys., California Univ., Santa Barbara, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bias voltage; bulk sample; capacitance measurement;
characterisation; design; differential
capacitance-voltage analyses; electron microscopy;
Junctions; measurement; mechanically adjustable
tunneling structures; molecular vibrational
spectroscopy; phonon spectroscopy; resistance;
resistance stability; semiconductor diodes, tunnel;
semiconductors; spectroscopy; squeezable tunneling
junctions; squeezable tunnelling junctions; stability;
standards; superconducting energy gap; superconductive
tunnelling; tunnelling",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering",
treatment = "A Application",
}
@Article{Lang:1986:EST,
author = "Norton D. Lang",
title = "Electronic Structure and Tunneling Current for
Chemisorbed Atoms",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "374--379",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We discuss the tunneling current density in the vacuum
region between two planar metal electrodes, one of
which has an atom chemisorbed on its surface. The
relation of this current distribution to the electronic
structure of the adatom is analyzed. The study of this
model leads to a better understanding of important
aspects of the current flow in the scanning tunneling
microscope. The emphasis is not so much on the question
of resolution discussed in other theoretical studies as
on the characteristic signatures of chemically
different atoms.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6845B (Sorption equilibrium); A7320H (Impurity and
defect levels; energy levels of adsorbed species);
A7340J (Metal-to-metal contacts)",
classification = "704; 712; 714",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adatom; adsorbed layers; chemisorbed atoms;
chemisorption; current density; current distribution;
design; electrodes; electron states; electronic
structure; planar metal; planar metal electrodes;
scanning tunneling microscope; semiconductor devices;
semiconductor materials --- Electronic Properties;
surface; Tunneling; tunneling current; tunnelling",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering",
treatment = "T Theoretical or Mathematical",
}
@Article{Baro:1986:ABT,
author = "A. M. Baro and R. Miranda and J. L. Carrascosa",
title = "Application to Biology and Technology of the Scanning
Tunneling Microscope Operated in Air at Ambient
Pressure",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "380--386",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have investigated the operation of the scanning
tunneling microscope (STM) in air at atmospheric
pressure, thus permitting the imaging of samples
without the need for subjecting them to a vacuum
environment. This may be of practical important for
many types of samples having biological and
technological interest. Imaging of biological samples
has been found to be possible after deposition onto a
flat structureless conducting substrate (highly
oriented pyrolytic graphite). Three-dimensional
profiles of structures derived from the virus
designated as bacteriophage phi 29 could thus be
obtained. Other profiles have been obtained which
indicate applicability to surfaces of technological
interest: for example, in the measurement of the
surface roughness of industrial components with
increased precision, suggesting use of the STM as a new
standard instrument for that purpose.",
acknowledgement = ack-nhfb,
affiliation = "Autonomous Univ of Madrid, Madrid, Spain",
affiliationaddress = "Autonomous Univ of Madrid, Madrid, Spain",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0780
(Electron and ion microscopes and techniques); A6116D
(Electron microscopy determinations); A8780
(Biophysical instrumentation and techniques)",
classification = "461; 741; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "Dept. of Fundamental Phys., Autonomous Univ. of
Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3D profiles; ambient pressure; atmospheric pressure;
bacteriophage; biological materials; biological
samples; biological techniques and instruments;
biology; components; design; highly oriented; human
factors; imaging; industrial; Microscopic Examination;
microscopy; pyrolytic graphite; scanning tunneling
microscope; scanning tunnelling; structureless
conducting substrate; surface roughness measurement;
surface topography measurement; virus",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Engineering \\ J.3 Computer Applications,
LIFE AND MEDICAL SCIENCES, Biology \\ I.4.9 Computing
Methodologies, IMAGE PROCESSING, Applications",
treatment = "A Application",
}
@Article{Elrod:1986:TM,
author = "S. A. Elrod and A. Bryant and A. L. {de Lozanne} and
S. Park and D. Smith and C. F. Quate",
title = "Tunneling microscopy from 300 to {4.2K}",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "387--395",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A scanning tunneling microscope (STM) has been
developed for operation over the full temperature range
from 300 to 4.2 K. At room temperature, the instrument
has been used to produce topographic images of grain
structure in a copper-titanium alloy foil and of atomic
structure on a Pt(100) surface. At low temperatures,
the instrument can be used in a new spectroscopic mode,
one which combines the high spatial resolution of the
STM with the existing technique of electron tunneling
spectroscopy. This new capability has been demonstrated
by using the microscope to probe spatial variations in
the superconducting character of a niobium-tin alloy
film.",
acknowledgement = ack-nhfb,
affiliation = "Xerox Corp, Palo Alto, CA, USA",
affiliationaddress = "Xerox Corp, Palo Alto, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0780
(Electron and ion microscopes and techniques); A6116D
(Electron microscopy determinations); A7470
(Superconducting materials)",
classification = "542; 544; 546; 549; 731; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "Xerox Corp., Palo Alto Res. Centre, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(100) surface; 4.2 to 300K; atomic structure;
character; copper titanium alloys; Cu-Ti alloy foil;
electron tunneling spectroscopy; grain structure;
Microscopic Examination; Nb-Sn alloy film; niobium
alloys; niobium tin alloys --- Microscopic Examination;
Pt; scanning tunneling microscope; scanning tunnelling
microscopy; spatial resolution; spatial variations;
spectroscopic analysis; spectroscopic mode;
superconducting; surface; temperature range; tin
alloys; topographic images; topography measurement;
type II superconductors",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "K.0 Computing Milieux, GENERAL",
treatment = "A Application; X Experimental",
xxtitle = "Tunneling Microscopy from 300 to 4.2 {K}",
}
@Article{Demuth:1986:STM,
author = "J. E. Demuth and R. J. Hamers and R. M. Tromp and M.
E. Welland",
title = "A Scanning Tunneling Microscope for Surface Science
Studies",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "396--402",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new design is described for a scanning tunneling
microscope intended for surface science studies. The
performance of the microscope is evaluated from
tunneling images obtained of the Si(111)7 multiplied by
7 surface. Periodic structures, point defects, and
grain boundary structures are observed with
atomic-scale resolution and are discussed.
Illustrations of various types of image processing and
data display are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Research Div, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A0780
(Electron and ion microscopes and techniques); A6116D
(Electron microscopy determinations); A6820 (Solid
surface structure)",
classification = "549; 741; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "IBM Res. Div. Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "atomic-; data display; design; elemental
semiconductors; grain boundary; grain boundary
structures; image processing; images; periodic
structure; point defects; scale resolution; scanning
tunneling microscope; scanning tunnelling microscopy;
semiconductor; Si; silicon; silicon and alloys; surface
(111)7*7; surface science; surface science studies;
surface structure; surface topography measurement;
Surfaces; tunneling",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Physics \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Engineering",
treatment = "A Application; X Experimental",
}
@Article{Hosler:1986:DPS,
author = "W. Hosler and R. J. Behm and E. Ritter",
title = "Defects on the {Pt(100)} surface and their influence
on surface reactions --- a scanning tunneling
microscopy study",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "403--410",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6820 (Solid surface structure); A8265J (Heterogeneous
catalysis at surfaces and other surface reactions)",
corpsource = "Inst. for Crystallography, Munich Univ., West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(100) surface; catalysts; catalytic activity; chemical
irregularities; decomposition; defect structure;
electron microscope examination of materials; ethylene;
irregularities; mass; phase transition; platinum; Pt;
scanning tunneling microscopy; structural; surface
chemistry; surface reactions; surface roughening;
surface step sites; surface structure; terrace edges;
thermal; transport; tunnelling",
treatment = "X Experimental",
}
@Article{Kaiser:1986:SES,
author = "W. J. Kaiser and R. C. Jaklevic",
title = "Spectroscopy of Electronic States of Metals with a
Scanning Tunneling Microscope",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "411--416",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have constructed a scanning tunneling microscope
(STM) and have obtained current-voltage derivative
spectra from metal surfaces. For Au(111) we have
observed an electronic surface state 0.4 eV below the
Fermi energy. This state has previously been observed
with photoemission and oxide tunneling experiments. We
have also observed strong peaks in spectra obtained
from Pd(111) which we identify with surface states and
effects derived from bulk energy bands. In the voltage
range investigated, tunneling takes place through the
entire vacuum gap between the metallic tip of the
microscope and the surface of the sample being
examined. The STM spectroscopy results are compared
with previous experimental work and theory. These
intrinsic surface states are claimed to be the first
which have been observed with the STM and demonstrate
its applicability to the investigation of surface
electronic structure.",
acknowledgement = ack-nhfb,
affiliation = "Ford Motor Co, Dearborn, MI, USA",
affiliationaddress = "Ford Motor Co, Dearborn, MI, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A7320 (Electronic surface states)",
classification = "531; 547; 741; 801; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "Dept. of Phys., Ford Motor Co., Dearborn, MI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Au; bulk; bulk energy bands; current-voltage
derivative; current-voltage derivative spectra; design;
electron states; electronic surface state; energy
bands; gold; gold and alloys --- Microscopic
Examination; intrinsic surface states; measurement;
metal surfaces; metals and alloys; palladium; palladium
and alloys; Pd; scanning tunneling microscope; scanning
tunnelling microscopy; spectra; Spectroscopic Analysis;
surface; surface (111); surface electronic state
spectroscopy; vacuum gap",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
treatment = "A Application; X Experimental",
}
@Article{Pohl:1986:SDC,
author = "Dieter W. Pohl",
title = "Some Design Criteria in Scanning Tunneling
Microscopy",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "417--427",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Optimum functioning of a scanning tunneling microscope
(STM) requires tip-to-sample position control with
picometer precision, a rough and fine positioning
capability in three dimensions, a scanning range of at
least 100 times the lateral resolution, a scanning
speed as high as possible, and simplicity of operation.
These requirements have to be satisfied in the presence
of building vibrations with up to micrometer-size
amplitudes, temperature drift, and other perturbations.
They result in design rules discussed for the
optimization of damping, stiffness, electrical control
circuitry, and the performance of the piezoelectric
actuators usually employed in STMs.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rueschlikon, Switz",
affiliationaddress = "IBM, Rueschlikon, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques)",
classification = "714; 732; 741; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "Zurich Res. Lab., IBM Corp., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "actuators; Applications; building vibrations; damping;
design; design criteria; design engineering; drift;
electrical control circuitry; lateral; microscopes;
microscopy; optimum functioning; picometer; picometer
precision; piezoelectric actuators; piezoelectric
devices; position control; positioning capability;
precision; resolution; scanning; scanning range;
scanning speed; scanning tunneling; scanning tunneling
microscopy; stiffness; temperature; tip-to-sample
position control; tunnelling microscopy",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Gomer:1986:PMA,
author = "Robert Gomer",
title = "Possible Mechanisms of Atom Transfer in Scanning
Tunneling Microscopy",
journal = j-IBM-JRD,
volume = "30",
number = "4",
pages = "428--430",
month = jul,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Various mechanisms for the sudden transfer of an atom
from or to the tip of a scanning tunneling microscope
are considered. It is concluded that thermal desorption
could be responsible and also that quasi-contact in
which the adsorbed atom is in effect `touching' both
surfaces, which would still be separated from each
other by 2-4 A, can lead to unactivated transfer via
tunneling. For barrier widths as small as 0.5 A,
however, tunneling becomes negligible.",
acknowledgement = ack-nhfb,
affiliation = "Univ of Chicago, Chicago, IL, USA",
affiliationaddress = "Univ of Chicago, Chicago, IL, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); A6845D
(Evaporation and condensation; adsorption and
desorption kinetics); A7970 (Field emission and field
ionization)",
classification = "741; 933; 941",
conference = "Scanning Tunneling Microsc Workshop, Oberlech",
corpsource = "James Franck Inst., Chicago Univ., IL, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adsorbed atom; atom transfer; barrier widths; design;
desorption; field evaporation; microscopes; microscopy;
Physical Properties; quasicontact; scanning tunneling
microscopy; scanning tunnelling; thermal desorption;
unactivated transfer",
meetingaddress = "Austria",
meetingdate = "Jul 1985",
meetingdate2 = "07/85",
subject = "I.4.9 Computing Methodologies, IMAGE PROCESSING,
Applications \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
treatment = "T Theoretical or Mathematical",
}
@Article{Muralt:1986:WLB,
author = "P. Muralt and D. W. Pohl and W. Denk",
title = "Wide-Range, Low-Operating-Voltage, Bimorph {STM}:
Application as Potentiometer",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "443--450",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An STM is described which operates at voltages less
than equivalent to 120 v. Its 3D scanner offers a wide
range of displacements, has low drift and hysteresis,
and exhibits good resolution. These features make it
interesting for technical applications. Its use as a
potentiometer is described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); B2390
(Electron and ion microscopes); B2860 (Piezoelectric
and ferroelectric devices); B7310B (Voltage); C3120C
(Spatial variables)",
classification = "741; 941; 942",
corpsource = "Inst. for Atomic and Solid State Phys., Freie Univ.,
Berlin, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0 to 120 V; 3D; 3D scanner; bender STM; bimorph;
design; features; low drift; low-operating-voltage;
microscopes; Performance; piezoelectric transducers;
position control; potentiometer; potentiometer
instruments; range of displacements; resolution;
scanner; scanning; scanning tunneling microscopy;
scanning tunneling microscopy (STM); STM; tunnelling
microscopy; voltage measurement; wide-range",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Buttiker:1986:TTT,
author = "M. Buttiker and R. Landauer",
title = "Traversal time for tunneling",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "451--454",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340G (Tunnelling: general); B2530 (Semiconductor
junctions and interfaces)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; probability; reflection; theory; transmission
probability; traversal time; tunneling phenomena;
tunnelling; tunnelling of carriers",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies",
treatment = "X Experimental",
}
@Article{Coombs:1986:PVT,
author = "J. H. Coombs and J. B. Pethica",
title = "Properties of Vacuum Tunneling Currents: Anomalous
Barrier Heights",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "455--459",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A design of STM which does not use vacuum internal
vibration isolation and may be cooled to liquid helium
temperatures is described. Tunneling current
characteristics underlying STM operations are
discussed. A model is presented to explain the
anomalously low (less than 1 eV) tunneling barrier
heights often observed. On the basis of this model we
suggest criteria for obtaining reliable STM images.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A7340G (Tunnelling: general)",
classification = "714; 741; 931; 933; 941",
corpsource = "Cavendish Lab., Cambridge Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "anomalous barrier heights; barrier heights; criteria
for obtaining reliable STM images; design; liquid He
temperatures; liquid helium temperatures; measurement;
microscopes; model; scanning tunneling microscope;
scanning tunnelling microscopy; semiconductor devices;
STM; Tunneling; vacuum tunneling currents",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Fink:1986:MTS,
author = "Hans-Werner Fink",
title = "Mono-Atomic Tips for Scanning Tunneling Microscopy",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "460--465",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "By field-ion microscopy techniques, we have been able
to create stable tips whose very ends are made up of
just one individual atom, deposited from the gas phase
onto an upper terrace of a pyramidal (111)-oriented
tungsten tip. The first three layers of the tip consist
of one, three, and seven atoms, respectively.
Consequences of these observations for the
understanding of energy transfer between gas-phase
atoms and a solid surface are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); A6116F
(Field-ion microscopy determinations; atom and ion
scattering techniques); B2390 (Electron and ion
microscopes)",
classification = "543; 715; 741; 931; 933; 941",
corpsource = "IBM Zurich Res. Labs., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "design; Field Emission; field emission ion microscopy;
field-ion microscopy; FIM; gas-phase atoms;
microscopes; microscopy; mono atomic tips; mono-atomic
tips; physics --- Atomic; pyramidal tip; scanning
tunneling microscopy; scanning tunnelling; single atom
tips; stable tips; STM; techniques; tungsten; tungsten
and alloys --- Microscopic Examination; tungsten tip;
VPE; W tip",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies",
treatment = "G General Review; X Experimental",
}
@Article{Feenstra:1986:STM,
author = "R. M. Feenstra and A. P. Fein",
title = "Scanning Tunneling Microscopy of Cleaved Semiconductor
Surfaces",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "466--471",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Scanning tunneling microscopy is used to study the
surface topography of cleaved GaAs(110) and Si(111)
surfaces. For GaAs we observe 1 multiplied by 1
periodicity, with a left bracket 001 right bracket
corrugation amplitude of typically 0.2 A and a left
bracket 1 OVER BAR 10 right bracket corrugation
amplitude of approx. 0.05 A. Surface point defects are
observed, consisting typically of approx. 0.7-A-deep
depressions extending along the rows. For Si(111), we
find a periodicity of two unit cells, indicating the
presence of the 2 multiplied by 1 reconstruction. We
observe a maximum left bracket 21 OVER BAR 1 OVER BAR
right bracket corrugation amplitude of 0.5 A and a left
bracket 01 OVER BAR 1 right bracket corrugation
amplitude of less than 0.02 A, consistent with the pi
-bonded chain model for this surface. Structural
disorder on the surface most commonly appears as
`protrusions' along or crossing over between the
chains. Orientational disorder is observed in the tilt
of the chains.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0630C (Spatial variables measurement); A6116D
(Electron microscopy determinations); A6170 (Defects in
crystals); B2390 (Electron and ion microscopes); B2520C
(Elemental semiconductors); B2520D (II-VI and III-V
semiconductors); B2550 (Semiconductor device
technology); B7320C (Spatial variables)",
classification = "547; 549; 712; 741; 941",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "amplitude; chain model; cleaved; cleaved semiconductor
surfaces; corrugation; corrugation amplitude; crystal
defects; depressions; design; elemental semiconductors;
GaAs; gallium arsenide; III-V semiconductors;
measurement; Microscopic Examination; orientational
disorder; periodicity; protrusions; scanning tunneling
microscopy; scanning tunnelling microscopy;
semiconducting gallium arsenide; semiconducting silicon
--- Microscopic Examination; semiconductor devices ---
Defects; semiconductor surfaces; semiconductor
technology; semiconductors; Si; silicon; STM; surface
point defects; surface topography",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Gimzewski:1986:STM,
author = "J. K. Gimzewski and A. Humbert",
title = "Scanning Tunneling Microscopy of Surface
Microstructure on Rough Surfaces",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "472--477",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An important feature of the scanning tunneling
microscope (STM) is its ability to image nonperiodic or
disordered surfaces with atomic or near-atomic lateral
and vertical resolution. Many physical and chemical
properties of surfaces and interfaces are sensitive to,
and in some cases determined by, random roughness or
surface disorder, although our understanding is
hampered by the lack of suitable techniques for
investigating atomic-scale features. We present STM
results for microcrystalline Ag and nanocrystalline
silicon surfaces which demonstrate the unique
topographic data obtainable using the STM. For
comparison, the STM studies are complemented by data
obtained using conventional techniques. The ability of
the STM to investigate the influence of growth
conditions on surface morphology, such as ion
bombardment, adsorption, and condensation temperature,
is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6116D (Electron microscopy determinations); A6480G
(Microstructure); A6820 (Solid surface structure);
B2390 (Electron and ion microscopes); B2520C (Elemental
semiconductors); B2550 (Semiconductor device
technology); B7320C (Spatial variables)",
classification = "547; 549; 712; 741; 933; 941",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adsorption; atomic-; bombardment; condensation
temperature; crystal microstructure; crystals ---
Microstructure; design; elemental semiconductors;
influence of growth conditions; ion; measurement;
microcrystalline Ag; Microscopic Examination;
nanocrystalline Si; nanocrystalline silicon surfaces;
random roughness; rough surfaces; scale features;
scanning; scanning tunneling microscope; scanning
tunneling microscopy; scanning tunnelling microscopy;
semiconducting silicon; semiconductors; silicon;
silver; silver and alloys --- Microscopic Examination;
STM; STM results; surface microstructure; surface
morphology; surface topography; topographic data
obtainable; topography; tunnelling microscopy",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Durig:1986:NFO,
author = "Urs D{\"u}rig and Dieter Pohl and Flavio Rohner",
title = "Near-Field Optical Scanning Microscopy with
Tunnel-Distance Regulation",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "478--483",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Optical image resolution (20 nm to 30 nm) has been
obtained with a near-field optical scanner using light
with a wavelength of half a micrometer. The key element
is an extremely small aperture (approx. 10 nm) placed
at the very top of a pyramidal screen. The aperture is
scanned in the immediate proximity of the surface to be
investigated, using vacuum tunneling to sense the
distance. The amount of light transmitted by both the
aperture and the sample depends sensitively on the
optical properties of the sample in the immediate
vicinity of the aperture.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0760P (Optical microscopy)",
classification = "741; 933; 941",
corpsource = "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.5 micron; 10 nm; 20 to; 30 nm; design; extremely
small aperture; image resolution; key element;
materials --- Microscopic Examination; microscopic
examination; near-field; near-field optical scanner;
NFOS; operation; optical microscopy; optical scanner;
optical scanning microscopy; Performance; pyramidal
screen; tunnel-distance regulation; vacuum tunneling",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "N New Development; X Experimental",
}
@Article{West:1986:CAS,
author = "Paul West and John Kramar and David V. Baxter and
Robert J. Cave and John D. Baldeschwieler",
title = "Chemical Applications of Scanning Tunneling
Microscopy",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "484--491",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The development of a scanning tunneling microscope at
the California Institute of Technology is well under
way. Electron tunneling has been demonstrated, and
preliminary surface images of gold films have been
obtained. Additional instrumental development is
required to achieve the atomic resolution which is
required for the study of chemical processes on
surfaces. A theoretical model is also being developed
for the study of tunneling of electrons from the probe
to surfaces with molecular species intervening between
the probe and the surface. These experimental tools and
theoretical models, which are being developed
concurrently, will be applied to study of chemical
systems and processes on surfaces. Some of the first
molecular species for study will include benzene and
pyridine on metal surfaces, and porphyrins and
phthalocyanines on pyrolytic graphite.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6845B (Sorption equilibrium); A8265J (Heterogeneous
catalysis at surfaces and other surface reactions);
B2390 (Electron and ion microscopes)",
classification = "741; 801; 941; 942",
corpsource = "Surface Sci. Lab., Aerojet Electro Systems Co., Azusa,
CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adsorbed layers; Applications; atomic resolution;
benzene; chemistry; design; electrons --- Tunneling;
experimentation; materials --- Chemistry; measurement;
metal surfaces; microscope; microscopes, electron;
molecular species; on surfaces; phthalocyanines;
porphyrins; pyridine; pyrolytic graphite; scanning
tunneling; scanning tunneling microscopy; scanning
tunnelling microscopy; STM; study of chemical
processes; surface; surface chemistry; theoretical
model; theory",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Chemistry \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies",
treatment = "A Application",
}
@Article{Abraham:1986:SMS,
author = "David W. Abraham and H. Jonathon Mamin and Eric Ganz
and John Clarke",
title = "Surface Modification with the Scanning Tunneling
Microscope",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "492--499",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We describe the design and operation of a scanning
tunneling microscope (STM) for studying surfaces. We
are able to prepare samples with ion bombardment and
heating, and to characterize them with LEED and Auger
analysis in situ before scanning with the STM. Data
acquisition and analysis are computer-controlled, with
a variety of options for presentation. In the near
future, we will be able to load-lock samples without
venting the UHV chamber. Our STM has very low thermal
drift, typically of the order of 1 A/min. In addition
to topographical measurements of the surface, we have
obtained spatially resolved maps related to the height
of the tunnel barrier. We have investigated the effects
of scratching the surface with the tip, and have also
succeed in depositing material from the tip onto the
surface. Surface diffusion of material is found to play
an important role in both of these processes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); B2390
(Electron and ion microscopes)",
classification = "741; 931; 933",
corpsource = "Center for Adv. Mater., Lawrence Berkeley Lab., CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Auger analysis; design; electrons --- Tunneling;
height; ion bombardment; LEED; load-lock samples; low
thermal drift; microscopes, electron; Microscopic
Examination; operation; performance; resolved maps;
sample preparation; scanning tunneling microscope;
scanning tunnelling microscopy; spatially; STM; surface
diffusion; surfaces; topographical measurements; tunnel
barrier; UHV chamber",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies",
treatment = "A Application; N New Development; X Experimental",
}
@Article{Ringger:1986:SAA,
author = "M. Ringger and B. W. Corb and H.-R. Hidber and R.
Schloegl and R. Wiesendanger and A. Stemmer and L.
Rosenthaler and A. J. Brunner and P. C. Oelhafen and
H.-J. Guentherodt",
title = "{STM} Activity at the {University of Basel}",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "500--508",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have built a scanning tunneling microscope (STM)
with a design similar to that published by Binnig and
Rohrer. An electromagnetic device called the `maggot'
has been developed for nanometer-scale movement over a
wide temperature range. We have studied the surface
topography of a Pd(100) single crystal, of a glassy
Pd$_{81}$Si$_{19}$ alloy, and of
graphite. Nanometer-scale structures have been produced
with the STM, indicating its potential for
high-resolution microfabrication.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6820 (Solid surface structure); B2390 (Electron and
ion microscopes)",
classification = "547; 549; 714; 741; 933; 941",
corpsource = "Inst. of Phys., Basel Univ., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "C; crystals; design; electromagnetic device;
experimentation; glassy Pd/sub 81/Si/sub 19/ alloy;
graphite; high-resolution; high-resolution
microfabrication; integrated circuit manufacture;
maggot; measurement; metallic glasses;
microfabrication; Microscopic Examination;
nanometer-scale movement; nanometer-scale structures;
nanometre actuator; palladium; palladium alloys;
palladium silicon alloys --- Microscopic Examination;
Pd; performance; scanning; scanning tunneling
microscope (STM); scanning tunnelling microscopy;
silicon alloys; single crystal; STM; surface
topography; surfaces --- Microscopic Examination;
tunneling microscope; University of Basel",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "P Practical; X Experimental",
}
@Article{vanKempen:1986:AHS,
author = "H. {van Kempen} and G. F. A. {van de Walle}",
title = "Applications of a High-Stability Scanning Tunneling
Microscope",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "509--514",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have constructed a scanning tunneling microscope
which is quite insensitive to vibrations and has a low
thermal drift. Low thermal drift is obtained by using a
compensating structure for the z-axis (perpendicular to
the sample surface) of the scan unit and by utilizing
symmetry in the x-and y-directions. To get a low
sensitivity to vibrations, we made the scanning unit
compact and rigid. A very light tip holder construction
allows a high scan speed. We studied different surfaces
of Ag single crystals and compared the results with a
study of the same surfaces from the inside by a method
based on the use of focused conduction electrons. A
terrace surface model, introduced to explain the
focusing results, has been confirmed for the Ag(001)
surface. A description of tip preparation and tip shape
is given.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); A6820
(Solid surface structure); B2390 (Electron and ion
microscopes)",
classification = "547; 741; 932; 933; 941",
corpsource = "Res. Inst. for Mater., Nijmegen Univ., Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Ag single crystals; axis; compact rigid microscope;
compensating structure; crystals; design; electrons ---
Tunneling; experimentation; focused conduction
electrons; high scan; high-; insensitive to; light tip
holder construction; low sensitivity; low thermal
drift; measurement; Microscopic Examination; scanning
tunneling microscope; scanning tunnelling microscopy;
silver; silver and alloys --- Microscopic Examination;
single crystals; speed; stability scanning tunneling
microscope; surface structure; surface topography
measurement; terrace surface model; tip holder; tip
preparation; tip shape; topography measurement;
vibrations; y-directions; z-",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "A Application; X Experimental",
}
@Article{Chiang:1986:CUS,
author = "S. Chiang and R. J. Wilson",
title = "Construction of a {UHV} Scanning Tunneling
Microscope",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "515--519",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have built an ultrahigh-vacuum tunneling microscope
(STM). The STM is mounted onto one flange in an
ultrahigh-vacuum chamber which is connected by a
transfer chamber to a surface-analysis system equipped
with 500-A-resolution SAM\slash SEM, XPS, LEED, and
sample-heating and sample-cleaning facilities. Samples
and tips can be moved throughout the combined vacuum
system. We describe the design and performance of the
instrument and show some preliminary data on Si(111).
We also show some recent results of experiments on tip
preparation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); A6820
(Solid surface structure); B2390 (Electron and ion
microscopes); B2520C (Elemental semiconductors); B2550
(Semiconductor device technology); B7320C (Spatial
variables)",
classification = "549; 633; 712; 741; 941",
corpsource = "IBM Almaden Res. Center, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis system; construction; design; elemental
semiconductors; experimentation; measurement;
microscope; microscopes; performance; preliminary data;
preparation; samples and tips; scanning tunneling
microscope; scanning tunnelling microscopy;
semiconducting silicon; semiconductor; Si surface;
silicon; silicon and alloys --- Microscopic
Examination; STM; surface structure; surface topography
measurement; surface-; tip; tip preparation; transfer
chamber; UHV scanning tunneling; ultrahigh-vacuum
chamber; ultrahigh-vacuum scanning tunneling
microscope; Vacuum Applications",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Berghaus:1986:STM,
author = "Th. Berghaus and H. Neddermeyer and St. Tosch",
title = "A scanning tunneling microscope for the investigation
of the growth of metal films on semiconductor
surfaces",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "520--524",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We describe a scanning tunneling microscope which is
part of an apparatus designed for the investigation of
metal-semiconductor surfaces. The main parts of the
tunneling unit are the piezoelectric walker ('louse')
carrying the sample for the coarse approach and a
piezoelectric xyz system for movement of the tip. The
xyz system is self-compensating with regard to uniform
thermal expansion. Our first measurements have been
obtained on a Au(110) surface. The spatial resolution
allows the observation of monoatomic steps. Corrugation
perpendicular to the rows and troughs of the (110)
surface with an amplitude around 1 A is also visible.
The noise in the z direction under optimum conditions
is smaller than 0.2 A rms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6116D (Electron microscopy determinations); A6855
(Thin film growth, structure, and epitaxy); B2390
(Electron and ion microscopes)",
classification = "531; 539; 712; 741; 933; 941",
corpsource = "Inst. for Exp. Phys., Ruhr-Univ., Bochum, West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Au; corrugation amplitude; crystals --- Microscopic
Examination; design; experimentation; films ---
Metallic; gold; Growth; growth of metal films;
investigation; measurement; metal-semiconductor
surfaces; metallisation; monoatomic steps; noise;
observation of monoatomic steps; of metal-semiconductor
surfaces; piezoelectric devices; piezoelectric walker;
piezoelectric xyz system; resolution; scanning
tunneling microscope; scanning tunnelling microscopy;
semiconductor materials; semiconductor surfaces;
semiconductor-metal boundaries; spatial; STM; surface;
uniform thermal expansion",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "X Experimental",
}
@Article{Aguilar:1986:STM,
author = "M. Aguilar and P. J. Pascual and A. Santisteban",
title = "Scanning Tunneling Microscope Automation",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "525--532",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A computerized system for scanning tunneling
microscope control, data acquisition, and display is
presented. It is based on the IBM Personal Computer
Model XT or AT. An IBM Data Acquisition and Control
Adapter card is used for the PC to control the
electronic equipment and to measure the voltages
applied to the three STM piezoelectric elements and the
tunneling current. An IBM Professional Graphics
Controller card is used for real-time display of the
STM `images'. The software has been designed in a
modular way to allow the replacement of these cards and
other improvements to the equipment. A discussion of
performance (scanning speed and size of images) is
included. Some image analysis and display tools are
included for a posteriori image processing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
B2390 (Electron and ion microscopes); B7210B (Automatic
test and measurement systems); C3380L (Laboratory
techniques); C7320 (Physics and Chemistry)",
classification = "722; 723; 741; 941",
corpsource = "Inst. of Solid-State Phys., Autonomous Univ. of
Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "a posteriori; automation; Computer Applications;
computer graphics; computerised instrumentation;
computerized system; computers, personal; data
acquisition; Data Acquisition and control Adapter card;
data processing --- Data Acquisition; design; display
tools; Graphics Controller card; IBM; IBM personal
computer; IBM Professional; image analysis; image
processing; image size; microcomputer applications;
microscopes; PC AT; PC XT; performance; piezoelectric
elements; real-time display; scanning speed; scanning
tunneling microscope; scanning tunneling microscope
control; scanning tunnelling microscopy; size of
images; STM; tunneling current",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics \\ J.6 Computer Applications,
COMPUTER-AIDED ENGINEERING",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Garcia:1986:TST,
author = "N. Garcia",
title = "Theory of Scanning Tunneling Microscopy and
Spectroscopy: Resolution, Image and Field States, and
Thin Oxide Layers",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "533--542",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Theoretical studies on the scanning tunneling
microscope and its spectroscopic version are reviewed.
This research has shown that the conductance of the
tunneling electrons is strongly influenced by the
classical image potential. The introduction of this
potential increases the conductance, although the slope
of the logarithm of the conductance versus electrode
separation remains practically constant. The image
force also has focusing effects on the tunneling
electrons and produces a minimum in the resolution for
approx. 5 A electrode separation. Spectroscopic levels
have been calculated for the image states held by the
tunneling potential. The results agree with
experimental data and indicate that the evolution of
the observed tunneling spectroscopic levels with
applied field is sensitive to the image potential, and
that the whole series of image states can be obtained
by extrapolation to zero applied field. Work is also
presented on the theoretical aspects of tunneling
spectroscopy of thin oxide layers grown on a metal
substrate --- NiO on Ni(100).",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6116D (Electron microscopy determinations); A6848
(Solid-solid interfaces); A6855 (Thin film growth,
structure, and epitaxy); A7340G (Tunnelling: general);
B2390 (Electron and ion microscopes)",
classification = "741; 801; 932; 933; 941",
corpsource = "Dept. of Fundamental Phys., Autonomous Univ. of
Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "5E-10 m; classical; conductance versus electrode
separation; design; electrons --- Tunneling;
experimental data; field states; focusing effects;
image force; image potential; image states; metal
substrate; microscopes; Ni; nickel; nickel compounds;
NiO-Ni; oxide layers; resolution; scanning tunneling
microscopy; scanning tunnelling microscopy;
spectroscopic levels; spectroscopic version;
spectroscopy --- Analysis; STM; theory; Theory; theory;
thin; thin oxide layers; tunneling electrons; tunneling
spectroscopy; tunnelling spectroscopy",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics",
treatment = "T Theoretical or Mathematical",
}
@Article{Schroer:1986:CAS,
author = "Peter H. Schroer and Jordan Becker",
title = "Computer Automation for Scanning Tunneling
Microscopy",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "543--552",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Computer automation has become a necessary part of the
scanning tunneling microscope (STM). We have designed a
data acquisition and image processing IBM PC\slash AT
workstation to complement the STM. The computer is used
to control the raster scans, to acquire multichannel
analog data, and to store the data for later analysis
both at the workstation and on a host computer. New
features include the use of PC\slash AT extended
memory, large backup storage, and image processing at
the workstation. Real-time gray-scale imaging provides
quick and comprehensive information to scientists and
engineers. The system is flexible enough to interface
with many microscope designs and with other laboratory
automation projects. A mainframe host computer system
is loosely coupled with the workstation to provide
off-line processing, hard copy, and mass storage.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0650 (Data handling and computation); A0780 (Electron
and ion microscopes and techniques); B2390 (Electron
and ion microscopes); C7320 (Physics and Chemistry)",
classification = "722; 723; 741; 933; 941",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "backup storage; comprehensive data acquisition;
Computer Applications; computerised instrumentation;
computers, personal; data processing --- Data
Acquisition; design; extended; features; gray-scale
imaging; hard copy; host computer; image processing ---
Computer Applications; image processing IBM PC/AT; line
processing; mainframe host computer system; mass
storage; memory; microscopes; microscopy; multichannel
analog data; off-; real time gray scale imaging;
scanning tunneling; scanning tunneling microscope;
scanning tunneling microscopy; scanning tunnelling
microscopy; STM; workstation",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ J.6 Computer Applications,
COMPUTER-AIDED ENGINEERING",
treatment = "G General Review; X Experimental",
}
@Article{Vieira:1986:BCS,
author = "S. Vieira",
title = "The behavior and calibration of some piezoelectric
ceramics used in the {STM}",
journal = j-IBM-JRD,
volume = "30",
number = "5",
pages = "553--556",
month = sep,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The high resolution and displacement measurement in
the scanning tunneling microscope are dependent upon
the behavior of the piezoelectric ceramics used for
moving the tip. Certain characteristics and features of
piezoelectric ceramics relevant to the desired
precision are discussed. These characteristics are the
relaxation aftereffects that follow the change of the
applied electric field, and the temperature dependence
of the piezoelectric response. The above effects have
been analyzed in four commercial piezoelectric ceramics
by the three-terminal capacitance measurement
technique.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0620H (Measurement standards and calibration); A0780
(Electron and ion microscopes and techniques); A7760
(Piezoelectricity and electrostriction); B2390
(Electron and ion microscopes); B2860 (Piezoelectric
and ferroelectric devices); B7130 (Measurement
standards and calibration); B7310Z (Other electric
variables); B7320C (Spatial variables)C3120C (Spatial
variables); C3240D (Electric transducers and sensing
devices); C3260B (Electric equipment)",
classification = "708; 714; 741; 812; 941",
corpsource = "Dept. of Fundamental Phys., Autonomous Univ. of
Madrid, Spain",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "actuators; atomic resolutions; behavior; calibration;
ceramic materials --- Piezoelectric; characteristics;
characteristics measurement; design; displacement
measurement; electric; experimentation; features; high
resolution; measurement; measurement technique;
micrometry; microscopes; microscopy; Performance;
piezoelectric ceramics; piezoelectric devices;
piezoelectric response; piezoelectricity; position
control; relaxation aftereffects; scanning tunneling
microscope; scanning tunnelling; scanning tunnelling
microscopy; STM; temperature dependence; three-terminal
capacitance; three-terminal capacitance measurement",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Standard cells \\ J.2 Computer Applications,
PHYSICAL SCIENCES AND ENGINEERING, Electronics",
treatment = "X Experimental",
}
@Article{Carnevali:1986:MIM,
author = "Paolo Carnevali and Piero Sguazzero and Vittorio
Zecca",
title = "Microtasking on {IBM} Multiprocessors",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "574--582",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The demand for very high computing performance has
become increasingly common in many scientific and
engineering environments. In addition to vector
processing, parallel computing is now considered a
useful way to enhance performance. However, parallel
computing tends to be unpopular among users because,
with presently available technology and software, it
requires explicit programmer intervention to exploit
architectural parallelism. This intervention can be
minor in some cases, but it often requires a
nonnegligible amount of program restructuring, or even
a reformulation of some of the algorithms used. In
addition, it makes program debugging considerably more
difficult. Tools for interprocedural program analysis,
able to analyze at high levels large FORTRAN programs
composed of many subroutines and to perform an
automatic high-level parallel decomposition, are being
developed at IBM. As an additional possibility,
low-level parallelism could also be exploited
automatically. This would greatly simplify the program
analysis needed in a compiler in order to automatically
insert parallel constructs in a program. However, this
could only be efficient in an environment in which the
cost for scheduling and synchronizing parallel
activities is extremely small. Such a `microtasking'
environment has been realized, at a prototype level,
for IBM multiprocessors and is described in this
paper.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C6140D
(High level languages); C6150C (Compilers, interpreters
and other processors); C6150J (Operating systems)",
classification = "722; 723",
corpsource = "IBM Eur. Center for Sci. and Eng. Co., Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Assembler level; assemblers; automatic high-level
parallel decomposition; compiler; computer
architecture; computer operating systems --- Program
Compilers; computer systems, digital; design;
fine-grain problems; FORTRAN; IBM computers; IBM
multiprocessors; interprocedural program analysis;
languages; low-level; microtasking; Multiprocessing;
multiprocessing programs; parallelism; performance;
program; program compilers; speed-ups; subroutines;
theory",
subject = "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Modes of Computation, Parallelism \\ C.4
Computer Systems Organization, PERFORMANCE OF SYSTEMS
\\ D.3.4 Software, PROGRAMMING LANGUAGES, Processors",
treatment = "P Practical",
}
@Article{Driscoll:1986:CAY,
author = "Graham C. {Driscoll, Jr.} and Donald L. Orth",
title = "Compiling {APL}: the {Yorktown APL} Translator",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "583--593",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Yorktown APL Translator (YAT) permits functions
written in APL to be compiled using an existing
compiler for part of the process. It also creates
tables that allow the APL2 Release 2 interpreter to
call the compiled code. The code can also be called
from a Fortran main routine. This paper outlines the
history of APL compilation, the motivation for
producing YAT, the design choices that were made, and
the manner of implementation. Sample APL functions and
their translations are shown, and the time required to
interpret these functions is compared with the time
required to execute the compiled code. Possible further
work is discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "APL; APL2 Release 2; compiled code; compiler; computer
operating systems; computer programming languages ---
Problem Orientation; design; Fortran main routine;
interpreter; languages; program compilers; Program
Compilers; program interpreters; YAT; Yorktown APL
translator; Yorktown APL translator (YAT)",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, APL \\ D.3.4 Software, PROGRAMMING
LANGUAGES, Processors",
treatment = "P Practical",
}
@Article{Ching:1986:PAC,
author = "Wai-Mee Ching",
title = "Program Analysis and Code Generation in an {APL\slash
370} Compiler",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "594--602",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have implemented an APL\slash 370 compiler which
accepts a subset of APL that includes most language
features and a majority of APL primitive functions. It
produces System\slash 370 assembly code directly to be
run independently of an interpreter. The compiler does
not require variable declarations. Its front end, which
is machine-independent, employs extensive type-shape
analysis based on a type-shape calculus of the
primitive functions and global dataflow analysis. Its
back end does storage mapping, code generation for
various primitive functions, and register management.
For one-line functions, compiled code executes at 2-10
times the speed of the interpreter. On programs with
many iterations, the execution time of the compiled
code not only is dramatically better than that of
interpretation, but is actually fairly close to that of
FORTRAN. This removes the performance penalty of APL in
computation-intensive applications.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; APL; APL/370 compiler; apl/370 compiler;
code generation; computer operating systems; computer
programming languages --- Problem Orientation; design;
execution time; global dataflow; language features;
languages; mapping; performance; primitive functions;
program compilers; Program Compilers; register
management; storage; System/370 assembly code;
type-shape; type-shape calculus",
subject = "D.3.4 Software, PROGRAMMING LANGUAGES, Processors,
Code generation \\ D.3.4 Software, PROGRAMMING
LANGUAGES, Processors, Compilers \\ D.2.4 Software,
SOFTWARE ENGINEERING, Program Verification",
treatment = "P Practical",
}
@Article{Cytron:1986:AOG,
author = "Ron Cytron and Paul G. Loewner",
title = "An automatic overlay generator",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "603--608",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We present an algorithm for automatically generating
an overlay structure for a program, with the goal of
reducing the primary storage requirements of that
program. Subject to the constraints of intermodule
dependences, the algorithm can either find a maximal
overlay structure or find an overlay structure that,
where possible, restricts the program to a specified
amount of primary storage. Results are presented from
applying this algorithm to three substantial
programs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6115 (Programming support); C6120 (File
organisation)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; automatic overlay generator; computer
programming --- Algorithms; computer systems
programming; design; intermodule dependences;
languages; overlay generators; primary storage
requirements; software tools; storage management;
Supervisory and Executive Programs",
subject = "D.3.3 Software, PROGRAMMING LANGUAGES, Language
Constructs, Data types and structures",
treatment = "P Practical",
}
@Article{Huynh:1986:EAF,
author = "Tien Huynh and Brent Hailpern and Lee W. Hoevel",
title = "An execution architecture for {FP}",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "609--616",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "FP is a functional programming language proposed by
John Backus to liberate programming from the `von
Neumann style.' We define here an architecture (FP
machine model) that is intended to allow easy and
efficient implementation of FP on a conventional von
Neumann machine. We present a new execution
architecture for FP based on Johnston's contour model
and on Hoevel and Flynn's notion of DEL\slash DCA
architectures. We call our architecture DELfp, a
Directly Executed Language for FP.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150J (Operating
systems)",
classification = "722",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; computer programming languages
--- Machine Orientation; DEL/DCA architectures; design;
directly executed language; Directly Executed Language;
execution architecture; FP; functional programming;
functional programming language; high level languages;
Johnston's contour; languages; machine model; model;
Neumann machine; supervisory programs; von",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, FP \\ D.3.4 Software, PROGRAMMING
LANGUAGES, Processors, Compilers \\ D.3.4 Software,
PROGRAMMING LANGUAGES, Processors, Interpreters",
treatment = "P Practical",
}
@Article{Moura:1986:EED,
author = "A. V. Moura",
title = "Early Error Detection in Syntax-Driven Parsers",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "617--626",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "633.68076",
abstract = "The early error detection capabilities of
syntax-driven parsers are studied. The classes of weak
precedence and simple mixed-strategy precedence parsers
are chosen as the object of study. Very similar
techniques could be used to obtain related results for
other classes of syntax-driven parsers. We investigate
whether the correct-prefix and the viable-prefix
properties can be enforced within these classes: A
negative result is obtained for the first class and a
positive one for the second. Moreover, for the simple
mixed-strategy class the relationship between early
error detection and parser size is studied. Some lower
bounds on the parser size are proven for simple
mixed-strategy precedence parsers that have the
viable-prefix property.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other
processors)",
classification = "722; 723",
corpsource = "IBM Software Technol. Center, Sao Paulo, Brazil",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computer operating systems; computer
systems programming; correct prefix properties; early;
error detection; grammars; languages; mixed-strategy
precedence; performance; precedence parsers; program
compilers; Program Compilers; reliability;
syntax-driven parsers; theory; verification;
viable-prefix properties; weak precedence",
subject = "D.3.4 Software, PROGRAMMING LANGUAGES, Processors,
Parsing \\ F.4.2 Theory of Computation, MATHEMATICAL
LOGIC AND FORMAL LANGUAGES, Grammars and Other
Rewriting Systems, Parsing",
treatment = "P Practical",
}
@Article{LAbbate:1986:CAT,
author = "A. L'Abbate and C. Paoli and R. Porinelli and M. G.
Trivella",
title = "A computerized autoradiographic technique for the
simultaneous high-resolution mapping of myocardial
blood flow and metabolism",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "627--634",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "By using both radioactive particulate and diffusible
tracers, combined with computerized processing and
analysis of generated autoradiographs, a new technique
for the high-resolution mapping of organ blood flow and
metabolism has been developed. In this paper the
technique has been evaluated for the myocardium.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8745H (Haemodynamics, pneumodynamics); A8760J
(Corpuscular radiation and radioisotopes); A8770E
(Diagnostic methods and instrumentation); C7330
(Biology and medicine)",
classification = "461",
corpsource = "Inst. of Clinical Physiol., Nat. Council of Res.,
Pisa, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "autoradiography; biological materials --- Blood;
biomedical engineering --- Computer Aided Diagnosis;
cardiology; computerized autoradiographic technique;
design; Diagnostic Applications; diffusible;
haemodynamics; high-resolution; human factors; mapping;
measurement; metabolism; myocardial blood flow;
myocardium; radiography; radioisotope scanning and
imaging; tracers",
subject = "J.3 Computer Applications, LIFE AND MEDICAL SCIENCES,
Health \\ I.4.9 Computing Methodologies, IMAGE
PROCESSING, Applications",
treatment = "P Practical; X Experimental",
}
@Article{Winarski:1986:MDC,
author = "Daniel J. Winarski and William W. Chow and Joseph G.
Bullock and Frederick B. Froehlich and Thomas G.
Osterday",
title = "Mechanical Design of the Cartridge and Transport for
the {IBM 3480} Magnetic Tape Subsystem",
journal = j-IBM-JRD,
volume = "30",
number = "6",
pages = "635--644",
month = nov,
year = "1986",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The IBM 3480 Magnetic Tape Subsystem has achieved
significant improvements over its predecessor, the
3420, in speed, data density, and floor-space
requirements. The 3-megabyte-per-second data rate of
the 3480, which is 2.4 times that of the 3420, was
accomplished through the use of chromium-dioxide tape
stored in a compact, single-reel cartridge threaded to
a take-up reel. A sixfold increase in data density over
the 3420 allowed reduction of the size of the 3480
reel, which was essential for rapid acceleration of the
tape in the 3480's reel-to-reel transport. The
increased data density also demanded substantial
improvements in tape guiding and tape-motion control.
This paper describes how mechanical analysis and design
contributed to the achievement of these advances and
aided in overcoming the ensuing problems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
classification = "721; 722",
corpsource = "IBM Gen. Products Div., Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cartridge; computer peripheral equipment; CrO$_2$
tape; data density; data storage, magnetic; design;
floor-space requirements; IBM 3480; IBM 3480 magnetic
tape subsystem; magnetic tape equipment; magnetic tape
storage; magnetic tape subsystem; speed; Tape; tape
guiding; tape-motion control; transport",
subject = "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS",
treatment = "N New Development; P Practical",
}
@Article{Goertzel:1987:DHI,
author = "Gerald Goertzel and Gerhard R. Thompson",
title = "Digital Halftoning on the {IBM 4250} Printer",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "2--15",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A method of reproducing high-quality continuous-tone
images via the IBM 4250 Printer is presented. The
approach is modeled on the halftone process used in
conventional lithography but is adapted to discrete
bilevel printing and digital processing. We use a
combination of standard and novel techniques. These
include generation and calibration of a set of halftone
dot patterns, randomized error propagation in pattern
selection, and resolution enhancement in areas of high
intensity gradients. The resultant images have good
gray-scale rendition and sharp edges without the
problems of contouring and worminess often associated
with digital image reproduction. We have named this
approach PREPRESS: Picture Rendition using Error
Propagation and Resolution Enhancement in Simulated
Screening.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 723; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; calibration; computer peripheral
equipment; contouring; digital; digital image
reproduction; discrete bilevel printing; dot patterns;
error propagation; gradients; halftone process; high
intensity; high-quality continuous-tone images; IBM
4250 printer; image processing --- Enhancement;
lithography; pattern selection; Picture Rendition;
PREPRESS; Printers; printers; printing; processing;
resolution enhancement; sharp edges; Simulated
Screening; worminess",
subject = "H.4.1 Information Systems, INFORMATION SYSTEMS
APPLICATIONS, Office Automation, Equipment \\ B.4.2
Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
Input/Output Devices, Data terminals and printers \\
I.3.1 Computing Methodologies, COMPUTER GRAPHICS,
Hardware architecture, Hardcopy devices \\ I.3.3
Computing Methodologies, COMPUTER GRAPHICS,
Picture/Image Generation, Digitizing and scanning",
treatment = "P Practical",
}
@Article{Anderson:1987:BAI,
author = "K. L. Anderson and F. C. Mintzer and G. Goertzel and
J. L. Mitchell and K. S. Pennington and W. B.
Pennebaker",
title = "Binary-Image-Manipulation Algorithms in the Image View
Facility",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "16--31",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Most current implementations of electronic mail deal
primarily with coded information. A
scanned-document-handling system that could scan a
document, distribute it, display it on terminals, and
print it on host-attached printers would offer a
similar convenience for documents in hard-copy rather
than coded form. For such a system to be practical,
fast software is needed for a number of
image-manipulation functions. The required functions
are compression, to reduce the size of the data files;
decompression, to reconstruct the scanned document;
scaling, to match the resolution of the scan to the
resolution of the display or printer; and rotation, to
reorient documents scanned sideways or upside down.
This paper describes a collection of algorithms
underlying fast software for manipulating binary images
that is used in the Image View Facility, a System\slash
370-based software package that permits the display and
printing of binary images at various resolutions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210G (Electronic mail); C5260 (Digital signal
processing)",
classification = "723; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; coded information; compression; computer
programming --- Algorithms; computerised picture
processing; decompression; electronic mail;
host-attached printers; image processing; Image View
Facility; image-manipulation functions; performance;
rotation; scaling; scanned-document-handling system;
System/370-based software package",
subject = "I.4.0 Computing Methodologies, IMAGE PROCESSING,
General \\ H.4.1 Information Systems, INFORMATION
SYSTEMS APPLICATIONS, Office Automation, Equipment \\
H.4.3 Information Systems, INFORMATION SYSTEMS
APPLICATIONS, Communications Applications, Electronic
mail",
treatment = "N New Development; P Practical",
}
@Article{Chen:1987:PPA,
author = "Yi-Hsin Chen and Frederick C. Mintzer and Keith S.
Pennington",
title = "{Panda}: {Processing Algorithm for Noncoded Document
Acquisition}",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "32--43",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "With a scanned-document-handling system, documents can
be scanned, stored, transmitted to remote locations,
viewed on displays and terminals, edited, and printed.
These systems hold much promise for office automation,
since they facilitate the communication and storage of
information that is not easily recoded into the
traditional formats for text and graphics. However,
most of the current systems that perform these
functions are intended for documents that at every
point are either black or white, but not gray. These
systems effectively exclude documents that contain
regions with varying shades of gray (known as
continuous-tone regions). PANDA, the Processing
Algorithm for Noncoded Document Acquisition, is a
technique that processes mixed documents, those that
contain continuous-tone regions in addition to text,
graphics, and line art. PANDA produces a high-quality
binary representation of all regions of a mixed
document. Furthermore, all regions of the binary
representation, including the continuous-tone image
regions, are significantly compressed by the
run-length-based compression algorithms that underlie
scanned-document-handling systems. This is a key
feature of PANDA. Indeed, this compression makes
practical the inclusion of mixed documents into many
existing systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260 (Digital signal processing); C7104 (Office
automation)",
classification = "723; 731; 741",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Applications; binary representation;
computerised picture processing; continuous-tone
regions; high-quality; image processing; information
theory --- Data Compression; mixed documents; Noncoded
Document Acquisition; office automation; PANDA;
performance; Processing Algorithm;
scanned-document-handling system",
subject = "I.4.1 Computing Methodologies, IMAGE PROCESSING,
Digitization, Scanning \\ I.4.3 Computing
Methodologies, IMAGE PROCESSING, Enhancement, Grayscale
manipulation",
treatment = "N New Development; P Practical",
}
@Article{Gupta:1987:YAD,
author = "Satish Gupta and David F. Bantz and Paul N. Sholtz and
Carlo J. Evangelisti and William R. DeOrazio",
title = "{YODA}: an Advanced Display for Personal Computers",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "44--57 (or 44--56??)",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "YODA (the YOrktown Display Adapter) is an experimental
display designed to improve the quality and speed of
users' interactions with personal computers. This paper
describes the YODA hardware architecture and software
design. Special attention is given to techniques used
for antialiasing. The various trade-offs and decisions
that were made are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays)",
classification = "721; 722; 723; 741",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(display); Adapter; advanced display; antialiasing;
computer graphic equipment; computer peripheral
equipment; computers, personal; display devices;
hardware architecture; personal computers; personal
computing; screens; software design; Terminals; YODA;
Yorktown Display; YOrktown Display Adapter (YODA)",
subject = "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
Input/Output Devices, Image display \\ I.4.3 Computing
Methodologies, IMAGE PROCESSING, Enhancement \\ D.2.6
Software, SOFTWARE ENGINEERING, Programming
Environments",
treatment = "N New Development; P Practical",
}
@Article{Chamberlin:1987:DCI,
author = "Donald D. Chamberlin",
title = "Document Convergence in an Interactive Formatting
System",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "58--72",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "One of the most complex aspects of document formatting
is the processing of references to remote objects such
as headings and figures. In the case of a forward
reference to an object that occurs later in the
document, two formatting passes are usually needed
before the document converges to a stable state. Some
documents require more than two passes to converge, and
cases are known of documents that never converge but
oscillate between two unstable states. This paper
describes the techniques used for resolving references
and detecting document convergence by the Interactive
Composition and Editing Facility, Version 2 (ICEF2).
ICEF2 is an interactive formatting system that allows
users to move about in a document, editing and
reformatting pages. The concepts of formatting pass and
document convergence are discussed in the context of
interactive formatting. A description is given of the
ICEF2 data store, a small relational database manager
with special features for detecting document
convergence. A sample ICEF2 style definition is
discussed to illustrate how ICEF2 deals with document
elements whose appearance depends on their location on
the page.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7106 (Word processing)",
classification = "723",
corpsource = "IBM Almaden Res. Center, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; data processing --- Word Processing;
database systems; design; document convergence;
document formatting; Editing; Facility; formatting
passes; human factors; Interactive Composition;
interactive formatting system; interactive systems;
remote objects; text editing; Version 2",
review = "ACM CR 8804-0295",
subject = "I.7.2 Computing Methodologies, TEXT PROCESSING,
Document Preparation, Format and notation \\ I.7.2
Computing Methodologies, TEXT PROCESSING, Document
Preparation \\ H.1.2 Information Systems, MODELS AND
PRINCIPLES, User/Machine Systems, Human factors \\
H.2.1 Information Systems, DATABASE MANAGEMENT, Logical
Design",
treatment = "N New Development; P Practical",
}
@Article{Cowlishaw:1987:LPS,
author = "M. F. Cowlishaw",
title = "{LEXX} --- a Programmable Structured Editor",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "73--80",
month = jan,
year = "1987",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.311.0073",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Many sophisticated and specialized editing programs
have been developed in recent years. These editors help
people manipulate data, but the diversity complicates
rather than simplifies computer use. LEXX is an editing
program that can work with the syntax and structure of
the data it is presenting, yet is not restricted to
just one kind of data. It is used for editing programs,
documents, and other material and hence provides a
consistent environment for the user regardless of the
editing task. The new live parsing technique used by
LEXX means that it can be programmed to handle a very
wide variety of structured data. The structure
information is, in turn, used to improve the
presentation of data (through color, fonts, and
formatting), which makes it easier for people to deal
with the text being edited.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130D (Document processing techniques)",
classification = "723",
corpsource = "IBM UK Ltd., Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming --- Structured Programming; data
processing; editing programs; editing task; fonts;
formatting; languages; LEXX; live parsing technique;
performance; programmable structured editor; structured
data; text editing; text editors programs; Word
Processing",
subject = "I.7.1 Computing Methodologies, TEXT PROCESSING, Text
Editing \\ E.1 Data, DATA STRUCTURES",
treatment = "N New Development; P Practical",
}
@Article{Mercer:1987:MES,
author = "Robert L. Mercer and Paul S. Cohen",
title = "A method for efficient storage and rapid application
of context-sensitive phonological rules for automatic
speech recognition",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "81--90",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In an automatic speech-recognition system, the
application of phonological rules to phonemic strings
in order to create phonetic graphs is a computationally
time-and storage-consuming process. A great many such
graphs must be constructed during the decoding phase;
thus it is important to be able to rapidly construct
phonetic graphs for strings of words from graphs of
individual words. However, because many phonological
rules operate across word boundaries or require
interword context, it is not possible to determine a
unique, context-independent phonetic graph for a word.
We describe a method for determining the phonetic graph
for a word in isolation, together with auxiliary
information to allow phonetic graphs for different
words to be rapidly interconnected to form a phonetic
graph for a string of words; the method also reduces
storage requirements significantly.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6130 (Speech analysis and processing
techniques); C5585 (Speech recognition and synthesis)",
classification = "723; 751",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic speech recognition; computer programming ---
Algorithms; context-sensitive; context-sensitive
grammars; decoding; decoding phase; design; efficient
storage; interword context; languages; phonemic;
phonetic graphs; phonological rules; rapid application;
Recognition; speech; speech recognition; storage
requirements; string; strings",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Speech
recognition and understanding",
treatment = "P Practical",
}
@Article{Kurtzberg:1987:FAS,
author = "Jerome M. Kurtzberg",
title = "Feature Analysis for Symbol Recognition by Elastic
Matching",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "91--95",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A technique has been developed for the recognition of
unconstrained handwritten discrete symbols based on
elastic matching against a set of prototypes generated
by individual writers. The incorporation of feature
analysis with elastic matching to eliminate unlikely
prototypes is presented in this paper and is shown to
greatly reduce the required processing time without any
deterioration in recognition performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1250B (Character recognition)",
classification = "723; 921",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "character recognition; computer programming ---
Algorithms; design; elastic matching; experimentation;
feature analysis; handwritten discrete symbols;
mathematical programming, dynamic; pattern recognition;
processing; recognition performance; symbol
recognition; time; unconstrained",
subject = "I.5.2 Computing Methodologies, PATTERN RECOGNITION,
Design Methodology, Feature evaluation and selection",
treatment = "T Theoretical or Mathematical",
}
@Article{Shield:1987:DFD,
author = "T. W. Shield and D. B. Bogy and F. E. Talke",
title = "Drop Formation by {DOD} Ink-Jet Nozzles: a Comparison
of Experiment and Numerical Simulation",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "96--110",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a comparison of a numerical
simulation of drop formation and ejection from a
drop-on-demand (DOD) ink-jet nozzle with experimental
observations from a particular nozzle-transducer
design. In the numerical simulation, first the pressure
waves in the transducer chamber are calculated using
inviscid compressible flow theory to obtain the
pressure history at the inner face of the nozzle plate.
Then a viscous momentum integral computation is applied
to the nozzle to obtain the velocity history at the
outer face of the nozzle plate. Finally, the free
surface shape is calculated using finite-difference
methods on the one-dimensional equations for an
inviscid incompressible free jet with surface tension
that uses the nozzle exit velocity history as the
driving boundary condition. The computations are
compared with drop formation photographs obtained from
a particular nozzle-transducer design. Encouraging
agreement is obtained, but the numerical model will
require added sophistication before detailed agreement
can be expected.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "619; 631; 723",
corpsource = "California Univ., Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computer peripheral equipment ---
Printers; Computer Simulation; DOD ink-jet; DOD ink-jet
nozzles; driving boundary condition; drop; drop
formation; drop-in-demand; ejection; experimentation;
finite-difference; formation photographs; free surface
shape; ink jet printers; integral computation; inviscid
compressible flow theory; methods; nozzle-transducer
design; nozzles; numerical simulation; pressure;
surface tension; viscous momentum; waves",
subject = "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
Input/Output Devices, Data terminals and printers \\
I.6.1 Computing Methodologies, SIMULATION AND MODELING,
Simulation Theory, Types of simulation (continuous and
discrete) \\ G.1.0 Mathematics of Computing, NUMERICAL
ANALYSIS, General, Numerical algorithms",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Pickover:1987:DVR,
author = "Clifford A. Pickover",
title = "{DNA} Vectorgrams: Representation of Cancer Genes as
Movements on a {2D} Cellular Lattice",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "111--119",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A brief introduction to a computer graphics
characterization of cancer DNA sequences, as well as
other biologically interesting sequences, is presented.
The procedure described takes DNA sequences containing
n bases and computes n two-dimensional real vectors.
When displayed on a planar unit-cellular lattice, these
characteristic patterns appear as a `DNA vectorgram,'
C(n). Several demonstration plots are provided which
indicate that C(n) is sensitive to certain statistical
properties of the sequence of bases and allows the
human observer to visually detect some important
sequence structural properties and patterns not easily
captured by traditional methods. The system presented
has as its primary focus the fast characterization of
the progression of sequence data using an interactive
graphics system with several controlling parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8780 (Biophysical instrumentation and techniques);
C7330 (Biology and medicine)",
classification = "723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2D cellular lattice; biological materials --- DNA;
biological techniques and instruments; biomedical
engineering --- Computer Aided Diagnosis; cancer DNA
sequences; cancer genes; cellular biophysics; computer;
computer graphics; DNA sequences; DNA vectorgrams;
graphics characterization; interactive graphics system;
Medical Applications; pattern recognition ---
Applications; planar unit-cellular lattice; properties;
real vectors; statistical; two-dimensional",
subject = "I.3.m Computing Methodologies, COMPUTER GRAPHICS,
Miscellaneous \\ J.3 Computer Applications, LIFE AND
MEDICAL SCIENCES, Biology",
treatment = "A Application",
}
@Article{Franaszek:1987:PHI,
author = "P. A. Franaszek",
title = "Path Hierarchies in Interconnection Networks",
journal = j-IBM-JRD,
volume = "31",
number = "1",
pages = "120--131",
month = jan,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper treats the problem of latency minimization
in an interconnection network for a system of N
high-performance devices. The networks considered here
have data transport separated from control, with the
data subnetwork designed so that each network function
requires only a single control message, and thus only
one contention-resolution delay. For sufficiently large
N it is shown that (for an abstract hardware model)
minimizing contention delays requires that each message
subject to such delays have more than one way of
reaching its destination (e.g., via a path hierarchy).
The overall approach is discussed in the context of the
processor-memory interconnection problem in parallel
computing.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C5620
(Computer networks and techniques)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer architecture; computer networks; computer
systems, digital; contention-resolution delay; control
message; data subnetwork; design; high-;
interconnection networks; latency minimization; memory
interconnection; parallel computing; parallel
processing; Parallel Processing; path hierarchy;
performance devices; processor-",
subject = "C.1.2 Computer Systems Organization, PROCESSOR
ARCHITECTURES, Multiple Data Stream Architectures
(Multiprocessors), Interconnection architectures",
treatment = "P Practical",
}
@Article{Gomory:1987:SI,
author = "Ralph E. Gomory",
title = "Science in Industry",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "151--153",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The industrial environment contains problems of
practical importance. To exploit that environment, an
industrial research group must accept the
responsibility for forming strong and useful
relationships with the rest of the company of which it
is a part. Opportunities for contributing to both the
industrial and academic worlds stem from the many
product-related problems for which existing science
offers no solution, but which suggest new scientific
directions.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classification = "901; 912; 921",
conference = "Math and Comput",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "engineering research; industrial engineering;
industrial environment; mathematical techniques;
science",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
}
@Article{Goldstine:1987:RED,
author = "H. H. Goldstine",
title = "Reflections on the Early Days of the Department",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "154--157",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "01A60 (01A74)",
MRnumber = "88i:01067",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The paper contains the reminiscences of the founding
director of the Mathematical Sciences Department in IBM
Research. It is interspersed with a number of anecdotes
about his friend and colleague, John von Neumann. It
attempts in a short space to recapitulate the history
of a distinguished department of mathematics in an
industrial environment in an informal and hopefully
humorous manner.",
acknowledgement = ack-nhfb,
affiliation = "American Philosophical Society, Philadelphia, PA,
USA",
affiliationaddress = "American Philosophical Society, Philadelphia,
PA, USA",
ajournal = "IBM J. Res. Develop.",
classification = "912; 921",
conference = "Math and Comput",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "industrial engineering; industrial environment;
mathematical techniques --- Applications",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
}
@Article{Cohen:1987:AMN,
author = "Hirsh Cohen",
title = "Applied Mathematics, a National View",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "158--161",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "01A60 (00A69)",
MRnumber = "88h:01038",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The development of applied mathematics in the United
States during the past forty years is described,
including the role of computers and computation in
enlarging and changing the field. The growth of the
profession is also discussed, along with needs for
training and funding for the future.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classification = "722; 921",
conference = "Math and Comput",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; applied mathematics; computers ---
Applications; mathematical techniques",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
}
@Article{Rivlin:1987:VAT,
author = "T. J. Rivlin",
title = "A view of approximation theory",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "162--168",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "41-01",
MRnumber = "88d:41002",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This is a selective survey of Approximation Theory
which touches on the concepts of best approximation,
good approximation, approximation of classes of
functions, approximation of functionals, and optimal
estimation.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290F (Interpolation and function approximation);
C4130 (Interpolation and function approximation)",
classification = "921; 922",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Approximation Theory; approximation theory; best
approximation; classes; estimation; function
approximation; functionals; functions; good
approximation; mathematical techniques; optimal;
optimal estimation; optimization; selective survey",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Glimm:1987:NAS,
author = "J. Glimm and D. H. Sharp",
title = "Numerical Analysis and the Scientific Method",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "169--177",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "00A69",
MRnumber = "88f:00023",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The computer has given rise to a new mode of
scientific practice, and today, computational science
stands beside theory and experiment as a fundamental
methodology. The impact of the computer revolution on
science can be projected from current trends. The
demands to be made on computing methodologies will be
reviewed. One of the demands is an ongoing need for
excellence in computational methodologies. Generic
difficulties encountered in meeting these challenges
will be discussed. Recent work of the authors and
others will be reviewed in this context.",
acknowledgement = ack-nhfb,
affiliation = "New York Univ, New York, NY, USA",
affiliationaddress = "New York Univ, New York, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290 (Numerical analysis); C4100 (Numerical
analysis)",
classification = "723; 921",
conference = "Math and Comput",
corpsource = "Courant Inst. of Math. Sci., New York Univ., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computational science; computer aided analysis;
computing methodologies; fundamental; mathematical
techniques; methodology; Numerical Analysis; numerical
analysis; scientific method",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Odeh:1987:SST,
author = "F. Odeh",
title = "Some Stability Techniques for Multistep Methods",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "178--186",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65L07 (65-02)",
MRnumber = "88i:65094",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A partial survey is given of sundry results in the
stability theory of multistep formulae when these are
used to integrate time-varying or nonlinear stiff
systems, with emphasis on systems arising in circuit
analysis.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130 (General analysis and synthesis methods)",
classification = "713; 921",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit analysis; electronic circuits; mathematical
techniques --- Nonlinear Equations; methods; multistep;
multistep methods; network analysis; nonlinear stiff
systems; stability; stability techniques; system
stability; Theory; time-varying networks; time-varying
systems",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
reviewer = "David F. Griffiths",
treatment = "T Theoretical or Mathematical",
}
@Article{Brayton:1987:FLF,
author = "R. K. Brayton",
title = "Factoring Logic Functions",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "187--198",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94C10",
MRnumber = "88c:94029",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We give a number of methods for obtaining different
factored forms for a given logic function. These
methods range from purely algebraic ones, which are
quite fast, to so-called Boolean ones, which are slower
but are capable of giving better results. One of the
methods given is both fast and gives good results, and
is useful in providing continuous estimates of area and
delay as logic synthesis proceeds. In multilevel logic
synthesis, each of the methods given has a use in a
system where run-time and quality are traded off. We
also formulate the problem of optimal algebraic
factorization, and pose its solution as a
rectangle-covering problem for which a heuristic method
is given.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5210 (Logic design
methods)",
classification = "723; 922",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algebraic factorization; area; Boolean; Boolean
Functions; Boolean functions; computer metatheory;
continuous; delay; estimates; expression; factored
form; factorization; heuristic method; logic design;
logic functions; logic synthesis; multilevel logic
synthesis; optimal algebraic; optimization;
parenthesized algebraic; rectangle-covering problem",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Yashchin:1987:SAT,
author = "Emmanuel Yashchin",
title = "Some Aspects of the Theory of Statistical Control
Schemes",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "199--205",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Control schemes (charts) are widely used in industrial
quality control as means of monitoring the quality of
manufactured products. These schemes provide a set of
criteria for testing whether a given sequence of
observations corresponds to an `on-target' state of the
production process. In the present work we consider
some graphical, computational, and statistical aspects
of control charting --- criteria of performance,
methods of derivation, analysis, design, etc. We
introduce the class of `Markov-type' control schemes
and discuss some of its properties.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control)",
classification = "731; 913; 922",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "charts; control; industrial quality; manufactured
products; Markov type control schemes; production
process; quality control; schemes; statistical
analysis; statistical control schemes; statistical
methods; Theory",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Johnson:1987:GPI,
author = "Ellis L. Johnson",
title = "The group problem and integer programming duality",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "206--212",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90C10 (49A55)",
MRnumber = "88c:90096",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Some duality results for integer programming based on
subadditive functions are presented first for linear
programs and then for the group problem. A similar
result for the knapsack problem is given and then a
relationship between facets for the group relaxation
and facets of the knapsack problem is given. The mixed
integer cyclic group problem is then considered and a
dual problem given. A common theme is to try to
characterize the strongest possible dual problem or
equivalently the smallest possible cone of subadditive
functions.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); C1180 (Optimisation
techniques)",
classification = "921",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; cone; cyclic group problem; functions;
group; group problem; integer programming; integer
programming duality; knapsack problem; linear programs;
mathematical programming, linear; relaxation;
subadditive",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Auslander:1987:FTR,
author = "L. Auslander and M. Shenefelt",
title = "{Fourier} Transforms that Respect Crystallographic
Symmetries",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "213--223",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "42B10 (20H15 51F15 82A60)",
MRnumber = "88h:42014",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In crystallography one has to compute finite Fourier
transforms that are often very large and often respect
crystallographic symmetries. In this paper we discuss
efficient finite Fourier transform algorithms on 5
multiplied by 5 multiplied by 5 points that respect a
collection of crystallographic symmetries. Although the
size is too small for any practical problems, the
methods indicated in this paper can be extended to
problems of meaningful size.",
acknowledgement = ack-nhfb,
affiliation = "City Univ of New York, New York, NY, USA",
affiliationaddress = "City Univ of New York, New York, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6150E (Crystal symmetry; models and space groups, and
crystalline systems and classes)",
classification = "482; 531; 804; 921; 933",
conference = "Math and Comput",
corpsource = "Center for Large Scale Comput., City Univ. of New
York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "crystal symmetry; crystallographic symmetries;
crystallography; crystals --- Orientation; fast Fourier
transforms; finite Fourier; Fourier Transforms;
mathematical techniques --- Matrix Algebra;
mathematical transformations; transform algorithms;
transforms",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
reviewer = "Marjorie Senechal",
treatment = "T Theoretical or Mathematical",
}
@Article{Adler:1987:TD,
author = "R. L. Adler",
title = "The torus and the disk",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "224--234",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "28D20 (58F08 94A17)",
MRnumber = "894 622",
bibdate = "Tue Jan 7 07:57:58 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is a survey of a coherent program of
mathematics spanning 28 years. It begins with questions
concerning classification and structure in ergodic
theory and abstract dynamical systems and describes the
author's involvement with toral automorphisms,
topological entropy, iteration of maps on the interval,
symbolic dynamics, and ultimate engineering
applications. It serves as a case study of how
unplanned-for practical applications can result from
the pursuit of mathematics for its own sake.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classification = "723; 921",
conference = "Math and Comput",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; codes, symbolic; ergodic theory;
mathematical techniques; symbolic dynamics; topological
entropy; toral automorphisms",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
}
@Article{Pippenger:1987:CCN,
author = "Nicholas Pippenger",
title = "The complexity of computations by networks",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "235--243",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94C10 (68Q30 90B10)",
MRnumber = "88c:94032",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "653.68016",
abstract = "We survey the current state of knowledge concerning
the computation of Boolean functions by networks, with
particular emphasis on the addition and multiplication
of binary numbers. These functions are among the most
important of those that networks are commonly used to
compute; they also have the merit of illustrating
nicely much of the theory of computation by networks.",
acknowledgement = ack-nhfb,
affiliation = "IBM, San Jose, CA, USA",
affiliationaddress = "IBM, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230B (Combinatorial switching theory)",
classification = "721; 723; 921",
conference = "Math and Comput",
corpsource = "IBM Almaden Res. Center, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "addition; binary numbers; Boolean functions; Boolean
Functions; Boolean functions; combinatorial switching;
computation; computations by networks; computer
metatheory; logic circuits, combinatorial; mathematical
techniques --- Polynomials; multiplication; networks",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "T Theoretical or Mathematical",
}
@Article{Coppersmith:1987:C,
author = "D. Coppersmith",
title = "Cryptography",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "244--248",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A60 (11T71)",
MRnumber = "88c:94019",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is concerned with two aspects of
cryptography in which the author has been working. One
is the Data Encryption Standard (DES), developed at IBM
and now in wide use for commercial cryptographic
applications. This is a `private key' system; the
communicants share a secret key, and the eavesdropper
will succeed if he can guess this key among its
quadrillions of possibilities. The other is the
Diffie--Hellman key exchange protocol, a typical
`public key' cryptographic system. Its security is
based on the difficulty of taking `discrete logarithms'
(reversing the process of exponentiation in a finite
field). We describe the system and some analytic
attacks against it.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130 (Data handling techniques)",
classification = "723; 902",
conference = "Math and Comput",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cryptography; data encryption standard; Data
Encryption Standard; Diffie--Hellman key exchange
protocol; discrete logarithms; eavesdropper;
exponentiation; IBM; private key; public key; secret
key; security; security of data; standards",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "P Practical",
}
@Article{Karp:1987:ERP,
author = "Richard M. Karp and Michael O. Rabin",
title = "Efficient Randomized Pattern-Matching Algorithms",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "249--260",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68Q20",
MRnumber = "89g:68021",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "653.68054",
abstract = "We present randomized algorithms to solve the
following string-matching problem and some of its
generalizations: Given a string X of length n (the
pattern) and a string Y (the text), find the first
occurrence of X as a consecutive block within Y. The
algorithms represent strings of length n by much
shorter strings called fingerprints, and achieve their
efficiency by manipulating fingerprints instead of
longer strings. The algorithms require a constant
number of storage locations, and essentially run in
real time. They are conceptually simple and easy to
implement. The method readily generalizes to
higher-dimensional pattern-matching problems.",
acknowledgement = ack-nhfb,
affiliation = "Univ of California, Berkeley, CA, USA",
affiliationaddress = "Univ of California, Berkeley, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130D (Document processing techniques)",
classification = "723; 921",
conference = "Math and Comput",
corpsource = "California Univ., Berkeley, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Algorithms; computer programming; computerised pattern
recognition; consecutive block; fingerprint functions;
fingerprints; mathematical techniques --- Algorithms;
pattern recognition; pattern-matching; problem;
randomized pattern-matching algorithms; storage
locations; string-matching; word processing",
meetingaddress = "Yorktown Heights, NY, USA",
meetingdate = "Dec 1985",
meetingdate2 = "12/85",
treatment = "P Practical",
}
@Article{Agarwal:1987:CNS,
author = "Ramesh C. Agarwal and James W. Cooley and Fred G.
Gustavson and James B. Shearer and Gordon Slishman and
Bryant Tuckerman",
title = "Clarification: {``New scalar and vector elementary
functions for the IBM System/370''} [{IBM J. Res.
Develop. {\bf 30} (1986), no. 2, 126--144}]",
journal = j-IBM-JRD,
volume = "31",
number = "2",
pages = "274--274",
month = mar,
year = "1987",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.312.0274",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "76W05",
MRnumber = "MR894626",
bibdate = "Mon Feb 12 08:07:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/elefunt.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Agarwal:1986:NSV}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wolfe:1987:SMP,
author = "Robert N. Wolfe and Michael A. Wesley and James C.
{Kyle, Jr.} and Franklin Gracer and William J.
Fitzgerald",
title = "Solid Modeling for Production Design",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "277--295",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a solid modeling and interactive
graphics computer system which is being used for
conceptual and design. Its development has resulted in
one of the first major production uses of solid
modeling in industry. The system was first tested in
pilot and limited production environments in 1981, and
is now in production use as the primary design tool for
mechanical portions of IBM's large computer mainframes.
Its introduction, development, integration, and use are
described and its functional and performance
characteristics as well as requirements for future
enhancements are discussed. (Edited author abstract)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C7430 (Computer
engineering)",
classification = "722; 723; 913",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "CAD; Computer Applications; computer graphics;
computer graphics --- Interactive; computer mainframes;
computer system; Data Systems; design; Division
Laboratory; future enhancements; IBM computers;
interactive graphics; mainframes; mechanical design
community; primary design tool; product design;
production design; production engineering --- Computer
Applications; production tool; solid modeling",
subject = "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
\\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations",
treatment = "P Practical",
}
@Article{Rossignac:1987:PCG,
author = "Jaroslaw R. Rossignac and Aristides A. G. Requicha",
title = "Piecewise-Circular Curves for Geometric Modeling",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "296--313",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "00A71 (65D10)",
MRnumber = "88h:00015",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Modern solid modelers must be able to represent a wide
class of objects, and must support Boolean operations
on solids. These operations are useful for defining
solids, detecting interferences and modeling
fabrication processes. Computing the boundaries of
solids defined through Boolean operations requires
algorithms for surface\slash surface and curve\slash
surface intersection. Cubic splines exhibit
second-degree continuity, but they are expensive to
process in solid modeling computations. We trade
second-degree continuity for computational simplicity,
and present a method for interpolating
three-dimensional points and associated unit tangent
vectors by smooth space curves composed of straight
line segments and circular arcs. These curves are
designated as PCCs (piecewise-circular curves) and have
continuous unit tangents. PCCs can be used in efficient
algorithms for performing fundamental geometric
computations, such as the evaluation of the minimal
distance from a point to a cure or the intersection of
a cure and a surface. Formulae and algorithms are
presented for generating and processing PCCs in solid
modelers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7400 (Engineering)",
classification = "722; 723; 913; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; blending; CAD; circular arcs;
computations; computer graphics; computer programming
--- Algorithms; cones; continuous unit tangents; cubic
splines; curves; cylinders; fundamental geometric;
geometric modeling; Geometry; growing; mathematical
techniques; minimal distance; natural; PCCs;
piecewise-circular curves; piecewise-linear techniques;
planes; primitives; quadratic surfaces; shrinking;
smooth space; solid modelers; spheres; straight line
segments; sweeping; theory; three-dimensional points;
toroidal; unit tangent vectors",
subject = "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations \\ I.3.5
Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Geometric
algorithms, languages, and systems \\ G.1.1 Mathematics
of Computing, NUMERICAL ANALYSIS, Interpolation",
treatment = "P Practical",
}
@Article{Farouki:1987:TAE,
author = "Rida T. Farouki",
title = "Trimmed-Surface Algorithms for the Evaluation and
Interrogation of Solid Boundary Representation",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "314--334",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Although trimmed surfaces play a fundamental role in
the deviation and processing of solid boundary
representations, they have received little attention to
date. We propose a trimmed-surface formulation
appropriate to the Boolean combination of primitive
bounded by a family of elementary surface patches
(e.g., planes, quadrics, ruled surfaces, surfaces of
revolution) with dual parametric rational polynomial
and implicitly algebraic equations. Partial
intersections between pairs of primitive surface
patches are formulated precisely as algebraic curves in
the parameter space of ech patch. These curves are
dissected into monotonic branches by the identification
of a characteristic point set. The consolidation of all
partial intersections yields a system of
piecewise-algebraic loops which define a trimming
boundary enclosing a parametric domain for the trimmed
patch. With few exceptions, the trimmed-surface
formulation is based on precisely defined mathematical
procedures, in order to achieve maximum robustness.
Some basic interrogation algorithms for solids bounded
by trimmed-surface elements are also presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7400 (Engineering)",
classification = "722; 723; 913; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algebraic curves; algebraic equations; algorithms;
Boolean combination; CAD; center of; characteristic;
computer graphics; computer programming --- Algorithms;
dual parametric rational polynomial; elementary
surface; evaluation; Geometry; gravity; implicit;
interrogation; mathematical techniques; modelling;
moments of inertia; monotonic branches; patches;
piecewise-algebraic loops; piecewise-linear techniques;
point set; point/solid classification; primitives;
ray-tracing; solid boundary representations; surface
area; theory; trimmed surfaces; trimmed-surface
algorithms; volume",
subject = "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations \\ G.1.5
Mathematics of Computing, NUMERICAL ANALYSIS, Roots of
Nonlinear Equations, Polynomials, methods for",
treatment = "P Practical",
xxtitle = "Trimmed-surface algorithms for the evaluation and
interrogation of solid boundary representations",
}
@Article{OConnor:1987:SUV,
author = "Michael A. O'Connor and Graziano Gentili",
title = "Simple Unit Vectors Orthogonal to a Given Vector",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "335--342",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "11Y16 (15A03 65F30)",
MRnumber = "88j:11088",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "653.68022",
abstract = "In geometrical computations it is often necessary to
find two unit vectors such that they and a given vector
form an orthogonal basis. Computationally simple forms
for the two unit vectors are useful. We show that they
cannot always be chosen to have rational coordinates,
but that in general the simplest possible vectors can
be chosen to involve only one square root. We develop
number-theoretic criteria for the existence of a
rational vector and an effective algorithm for
calculation of one if it exists. We also discuss
storage and time requirements of the algorithm.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods)",
classification = "723; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; computational geometry; computer graphics;
computer programming --- Algorithms; geometrical
computations; mathematical techniques; number theory;
one square root; orthogonal basis; rational vector;
theory; unit vectors; vectors; Vectors; verification",
reviewer = "J. L. Brenner",
subject = "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Geometrical problems and computations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous \\ F.2.1 Theory of Computation, ANALYSIS
OF ALGORITHMS AND PROBLEM COMPLEXITY, Numerical
Algorithms and Problems, Number-theoretic
computations",
treatment = "T Theoretical or Mathematical",
}
@Article{Evans:1987:SGO,
author = "Roger C. Evans and George Koppelman and V. T. Rajan",
title = "Shaping geometric objects by cumulative translational
sweeps",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "343--360",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper introduces the cumulative translational
sweep (CTS) as a tool for shaping geometric objects. It
describes how it may be applied, in combination with
Boolean operations, to stimulate growth and shrinking
over the boundary regions of polyhedral models, and
how, by creating additional facets, it may be used to
achieve global rounding effects long model edges and
around their vertices. CTSs are examined in terms of
conceptual framework that describes their effects as
Minkowski sums --- of the polyhedra to be swept, with
convex polyhedra from the class of mathematical objects
known as zonotopes. Included is a discussion of
applications in the OYSTER program, a CAD system for
the simulation of semiconductor wafer fabrication.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7410D (Electronic engineering)",
classification = "713; 714; 723; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boolean operations; Boolean operations; boundary
regions; CAD system; circuit CAD; computational
geometry; Computer Aided Design; computer graphics;
convex polyhedra; cumulative translational sweeps;
design; geometric objects; global rounding effects;
growth; integrated circuit manufacture; mathematical
techniques --- Geometry; Minkowski sums; model edges;
OYSTER program; polyhedral models; semiconductor;
semiconductor wafer; semiconductor wafer fabrication;
shaping; shrinking; technology; theory; translational
sweeps; vertices; zonotopes",
subject = "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Geometric
algorithms, languages, and systems \\ J.6 Computer
Applications, COMPUTER-AIDED ENGINEERING \\ C.4
Computer Systems Organization, PERFORMANCE OF SYSTEMS,
Modeling techniques",
treatment = "P Practical",
xxtitle = "Shaping Geometric Objects by Cumulative Translational
Sweep",
}
@Article{Srinivasan:1987:VDM,
author = "Vijay Srinivasan and Lee R. Nackman",
title = "{Voronoi} Diagram for Multiply-Connected Polygonal
Domains. {I}: Algorithm",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "361--372",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68U05 (11H99 51-04)",
MRnumber = "906 140",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Voronoi diagrams of multiple-connected polygonal
domains (polygons with holes) can be of use in
computer-aided design. We describe a simple algorithm
that computes such Voronoi diagrams in O(N(log$_2$) N
plus H) time, where N is the number of edges and H is
the number of holes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1160 (Combinatorial mathematics)",
classification = "723; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; CAD; computational geometry; computer
graphics; computer programming --- Algorithms;
computer-aided design; design; edges; Geometry; holes;
mathematical techniques; multiply-connected polygonal
domains; polygonal domains; theory; verification;
Voronoi diagram; Voronoi diagrams",
subject = "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Geometrical problems and computations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous",
treatment = "T Theoretical or Mathematical",
}
@Article{Meshkat:1987:VDM,
author = "Siavash N. Meshkat and Constantine M. Sakkas",
title = "{Voronoi} Diagram for Multiply-Connected Polygonal
Domains. {II}: Implementation and Application",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "373--381",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68U05 (11H99 51-04)",
MRnumber = "906 141",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Voronoi diagrams have many novel applications in
computer-aided design. An implementation of a Voronoi
diagram algorithm described in a companion paper by
Srinivasan and Nackman is presented. This Voronoi
diagram is then used for an application in which
equivalent resistance networks are derived from a
boundary representation of a two-dimensional VLSI
geometry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); C7410D
(Electronic engineering)",
classification = "703; 713; 714; 723; 921",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithm; boundary representation; circuit CAD;
computational geometry; Computer Aided Design; computer
graphics; computer-aided design; design; dimensional
VLSI geometry; electric networks, active --- Computer
Aided Design; equivalent resistance networks;
integrated circuits, VLSI; mathematical techniques ---
Geometry; polygonal domains; resistance networks;
theory; two-; two-dimensional VLSI geometry; VLSI;
Voronoi diagram; Voronoi diagram, polygonal domains,
resistance networks, two-dimensional VLSI geometry,
boundary representation; Voronoi diagrams",
subject = "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Geometrical problems and computations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous \\ I.1.2 Computing Methodologies,
ALGEBRAIC MANIPULATION, Algorithms, Analysis of
algorithms",
treatment = "P Practical",
}
@Article{Hood:1987:AAI,
author = "Sarah J. Hood and Ronald C. Rosenberg and David H.
Wither and Tong Zhou",
title = "An algorithm for automatic identification of
{R}-fields in bond graphs",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "382--390",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Bond graphs may be used to model the power flow in
dynamic systems. They are especially attractive for
modeling systems which function in coupled energy
domains, for example, electromechanical systems. For
such systems, bond graphs can be used to provide a
natural subdivision into power\slash energy fields:
storage, sources, transformers, and dissipation, In
nonlinear dissipative fields, implicit, nonlinear,
coupled systems of algebraic equations may arise.
Causality assignment of the bond graph provides a basis
for detecting implicitly formulations. This paper
presents an algorithm for detection and solution of
these forms within a model, thereby providing an
opportunity for efficient numerical solutions, and
includes an introduction into bond graphs via an
electromechanical system example.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0250 (Combinatorial mathematics); B0290K (Nonlinear
and functional equations); C1160 (Combinatorial
mathematics); C4150 (Nonlinear and functional
equations)",
classification = "723; 731; 921",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; automatic identification; bond graphs;
causality; computer programming --- Algorithms; control
systems --- Identification; coupled energy domains;
dissipation; dynamic systems; efficient;
electromechanical system; electromechanical systems;
Graph Theory; graph theory; mathematical techniques;
nonlinear dissipative fields; nonlinear equations;
numerical solution; power flow; R-fields; r-fields;
sources; storage; theory; transformers",
subject = "G.1.5 Mathematics of Computing, NUMERICAL ANALYSIS,
Roots of Nonlinear Equations, Systems of equations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous",
treatment = "T Theoretical or Mathematical",
}
@Article{Darema:1987:PAC,
author = "Frederica Darema and Scott Kirkpatrick and V. A.
Norton",
title = "Parallel Algorithms for Chip Placement by Simulated
Annealing",
journal = j-IBM-JRD,
volume = "31",
number = "3",
pages = "391--402",
month = may,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We explore modifications to the standard simulated
annealing method for circuit placement which make it
more suitable for use on a shared-memory parallel
computer. By employing chaotic approaches we allow the
parallel algorithms to deviate from the algorithm
defined for a serial computer and thus obtain good
execution efficiencies for large numbers of processors.
The qualitative behavior of the parallel algorithms is
comparable to that of the serial algorithm.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
C7410D (Electronic engineering)",
classification = "713; 714; 722; 723",
corpsource = "IBM Thomas Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; chaotic approaches; chip placement;
circuit layout CAD; circuit placement; computer;
computer programming --- Algorithms; computer systems,
digital; design; execution efficiencies; integrated
circuits --- Computer Aided Design; measurement;
parallel algorithms; Parallel Processing; performance;
qualitative behavior; shared-memory parallel; simulated
annealing; theory",
subject = "G.1.0 Mathematics of Computing, NUMERICAL ANALYSIS,
General, Parallel algorithms \\ F.1.2 Theory of
Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
Computation, Parallelism \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS \\ B.7.2 Hardware,
INTEGRATED CIRCUITS, Design Aids, Placement and
routing",
treatment = "P Practical",
}
@Article{Wakefield:1987:REP,
author = "Scott P. Wakefield and Michael J. Flynn",
title = "Reducing Execution Parameters Through Correspondence
in Computer Architecture",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "420--434",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This study develops and extends techniques to provide
architectural correspondence between high-level
language objects and hardware resources to minimize
execution time parameters (memory traffic, program
size, etc.). A resulting computer instruction set
called Adept has been emulated, and a compiler has been
developed with it as the target language. Although the
study was restricted to Pascal, the resulting data are
generally applicable to the execution time environment
of any procedure-based language. Data indicate that
significant bandwidth reductions are possible compared
to System\slash 370, VAX, P-code, etc. The average
improvement ratios realized were instruction bandwidth
reduction: 3.46; data read reduction (in bytes): 5.42;
data write reduction (in bytes): 14.72.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C5220
(Computer architecture); C6140D (High level
languages)",
classification = "722; 723",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Adept; architectural; architectural correspondence;
bandwidth reduction; based language; compiler;
computational complexity; computer architecture;
computer instruction set; computer performance;
computer programming languages; correspondence; data
read reduction; data write reduction; design; execution
parameters; execution time; execution time environment;
hardware; high-level language; high-level language
objects; instruction; instruction set; measurement;
memory; minimize execution time parameters; Pascal;
Performance; performance; procedure-; program size;
resources; sets; traffic",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS",
treatment = "A Application; X Experimental",
}
@Article{Cvetanovic:1987:PAF,
author = "Zark Cvetanovic",
title = "Performance Analysis of the {FFT} Algorithm on a
Shared-Memory Parallel Architecture",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "435--451",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a model for the performance
prediction of FFT algorithms executed on a
shared-memory parallel computer consisting of N
processors and the same number of memory modules. The
model applies a deterministic analysis to estimate the
communication delay through the interconnection network
by assuming that all requests arrive at the network in
bursts. Our results indicate that the communication
delay is affected by the method applied to allocate
data to memory modules. For the case in which all data
items referenced by a processor during an iteration are
allocated to a single memory module, the best-case
communication time complexity grows as O left bracket
(logN)**2/N right bracket. The worst-case communication
time complexity for this case, obtained by a different
allocation of data to memory modules, is increased to O
left bracket (logN)/ ROOT N right bracket due to high
network contention.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods); C4230 (Switching
theory); C4240 (Programming and algorithm theory);
C5220 (Computer architecture); C5470 (Performance
evaluation and testing)",
classification = "722; 723; 921",
corpsource = "Digital Equipment Corp., Boxborough, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; architecture; best-case; bursts;
communication; communication delay; communication time;
computational complexity; computer architecture;
computer programming --- Algorithms; data storage,
digital; design; deterministic analysis; fast Fourier
transforms; FFT algorithm; interconnection network;
iterative; mathematical transformations --- Fast
Fourier Transforms; measurement; memory modules;
methods; model; multiprocessor interconnection
networks; network contention; number of; parallel;
parallel architecture; parallel architectures;
performance; Performance; performance analysis;
performance evaluation; performance prediction;
shared-memory; shared-memory parallel; theory; time
complexity; worst-case",
subject = "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Modes of Computation, Parallelism \\ C.1.3
Computer Systems Organization, PROCESSOR ARCHITECTURES,
Other Architecture Styles \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS \\ F.2.1 Theory of
Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
COMPLEXITY, Numerical Algorithms and Problems,
Computation of transforms",
treatment = "T Theoretical or Mathematical",
}
@Article{Cvetanovic:1987:BWM,
author = "Zarka Cvetanovic",
title = "Best and Worst Mappings for the Omega Network",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "452--463",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents a study of the best and worst
mappings for the omega network proposed by D. H. Lawrie
in 1975. We identify mappings that produce no conflicts
in the network and mappings that produce a maximum
number of conflicts. The analysis of mappings for some
typical applications shows that an initial allocation
of data to memory modules determines the contention
within the network for all iterations of the algorithm.
For the case of the FFT and the bitonic sort algorithm
executed on a shared-memory architecture, we prove that
if no conflicts are produced during the first iteration
of the algorithm, then no conflicts are produced during
any other iteration. If a maximum number of conflicts
are produced during the first iteration, then a maximum
number of conflicts are produced during all other
iterations of the algorithm. For the d-dimensional grid
computations where communication is required with 2d
nearest neighbors, we prove that if the initial
allocation produces no conflicts within the network,
then communication with all the neighbors is
conflict-free. If the initial allocation produces a
maximum number of conflicts, then communication with
all the neighbors is maximum-conflict.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4190 (Other numerical methods); C4230 (Switching
theory); C4240 (Programming and algorithm theory);
C5220 (Computer architecture); C5470 (Performance
evaluation and testing); C6130 (Data handling
techniques)",
classification = "721; 722; 723",
corpsource = "Digital Equipment Corp., Boxborough, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Analysis; best mappings; bit reversal;
bit-permute mappings; bitonic sort algorithm;
computational complexity; computer architecture;
computer networks; computer programming --- Algorithms;
conflicts; d-dimensional grid computations; design;
fast Fourier transforms; FFT; initial allocation of
data; mappings; mappings that produce no conflicts;
measurement; memory contention; memory modules;
multiprocessor interconnection networks; network
contention; omega network; parallel; parallel
architectures; perfect shuffle; performance;
shared-memory architecture; sorting; switching theory;
verification; worst",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ C.1.2 Computer Systems Organization,
PROCESSOR ARCHITECTURES, Multiple Data Stream
Architectures (Multiprocessors), Interconnection
architectures",
treatment = "T Theoretical or Mathematical",
}
@Article{Stone:1987:EST,
author = "Harold S. Stone and Janice M. Stone",
title = "Efficient Search Techniques --- an Empirical Study of
the {N-Queens} Problem",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "464--474",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper investigates the cost of finding the first
solution to the N-Queens Problem using various
backtrack search strategies. Among the empirical
results obtained are the following: (1) To find the
first solution to the N-Queens Problem using
lexicographic backtracking requires a time that grows
exponentially with increasing values of N. (2) For most
even values of N less than 30, search time can be
reduced by a factor from 2 to 70 by searching
lexicographically for a solution to the N plus 1-Queens
Problem. (3) By reordering the search so that the queen
placed next is the queen with the fewest possible moves
to make, it is possible to find solutions quickly for
all N less than 97, improving running time by dozens of
orders of magnitude over lexicographic backtrack
search. To estimate the improvement, we present an
algorithm that is a variant of algorithms of Knuth and
Purdom for estimating the size of the unvisited portion
of a tree from the statistics of the visited portion.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1230 (Artificial intelligence); C4240 (Programming
and algorithm theory)",
classification = "723; 921; 922",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; artificial intelligence; backtrack;
backtracking; computational complexity; computer
metatheory; design; efficient search techniques;
empirical results; empirical study; exponential time;
first solution; lexicographic; mathematical techniques;
N-Queens Problem; n-queens problem; orders of magnitude
improvement; performance; probability --- Game Theory;
search rearrangement; search strategies; search trees;
theory; Trees; unvisited portion; visited portion",
subject = "I.2.8 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Problem Solving, Control Methods, and
Search, Backtracking \\ F.2.2 Theory of Computation,
ANALYSIS OF ALGORITHMS AND PROBLEM COMPLEXITY,
Nonnumerical Algorithms and Problems, Sorting and
searching",
treatment = "X Experimental",
}
@Article{Sitaram:1987:IIM,
author = "Dinkar Sitaram",
title = "The inconsistency index method for estimating the
accuracy of {Schweitzer}'s approximation",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "475--483",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B22",
MRnumber = "88i:90095",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Product-form queueing networks have proved to be
useful for predicting the performance of computer
systems. In practice, these networks are analyzed using
approximate methods because exact methods are
computationally too expensive. Schweitzer's
approximation is one of the most commonly used.
However, there is no method for estimating the error in
the solution. This paper proposes a new approach for
estimating the error in Schweitzer's approximation for
fixed-rate product-form networks. It is based on
detecting the extent to which the approximation
assumptions used hold. Empirical evidence is presented
to show that this approach can be used to accurately
predict the error in the approximation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B0250 (Combinatorial
mathematics); B0290B (Error analysis in numerical
methods); C1140C (Queueing theory); C1160
(Combinatorial mathematics); C4110 (Error analysis in
numerical methods)",
classification = "722; 723; 921; 922",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Analysis; approximation assumptions; approximation
error; computer systems, digital; design; empirical
evidence; error analysis; error estimation; fixed-;
graph theory; inconsistency index; mathematical
techniques --- Approximation Theory; measurement;
method; performance; probability --- Queueing Theory;
product-form networks; queueing networks; queueing
theory; rate product-form networks; Schweitzer's
approximation; theory",
subject = "G.m Mathematics of Computing, MISCELLANEOUS, Queueing
theory \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS",
treatment = "T Theoretical or Mathematical",
}
@Article{Takagi:1987:EAR,
author = "Hideaki Takagi",
title = "Exact Analysis of Round-Robin Scheduling of Services",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "484--488",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "90B35 (90B15)",
MRnumber = "88k:90100",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A multi-queue, cyclic-service model with a
single-message buffer is considered. Each message
consists of a number of characters, and one character
is served at the server's each visit. Exact and
explicit expressions are derived for performance
measures, such as mean cycle time, mean message
response time, and mean response time conditioned on
the message length.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240C (Queueing theory); B6150 (Communication system
theory)C1140C (Queueing theory); C5470 (Performance
evaluation and testing); C6150J (Operating systems)",
classification = "723; 921; 922",
corpsource = "IBM Japan Ltd., Tokyo Res. Lab., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer metatheory; cyclic-service model; design;
exact analysis; explicit expressions; mathematical
techniques; mean cycle time; mean message response
time; mean response time conditioned; measurement;
multi queue model; on message length; performance;
performance evaluation; performance measures;
probability; queueing theory; Queueing Theory;
round-robin scheduling; round-robin scheduling of;
scheduling; services; single-message buffer; theory",
subject = "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Sequencing and scheduling \\ C.4 Computer
Systems Organization, PERFORMANCE OF SYSTEMS \\ G.m
Mathematics of Computing, MISCELLANEOUS, Queueing
theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Huang:1987:SDT,
author = "Ching-Chao Huang and Leon L. Wu",
title = "Signal Degradation Through Module Pins in {VLSI}
Packaging",
journal = j-IBM-JRD,
volume = "31",
number = "4",
pages = "489--498",
month = jul,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper investigates chip-to-chip communication
through the modules and board in VLSI packaging.
Transmission line models and frequency-dependent
transmission line parameters are used in finding the
frequency response. The time-domain solution is then
obtained through the inverse Fast Fourier Transform.
The results show that uncoated module pins, even of
relatively short length, can cause severe signal
degradation because of their magnetic property. The
signal behavior is improved dramatically, when the
module pins are coated with nonmagnetic conductive
material.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2570 (Semiconductor
integrated circuits)",
classification = "421; 713; 714",
corpsource = "IBM Gen. Technol. Div., East Fishkill Facility,
Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "chip-to-chip communication; conductive; dependent
transmission line parameters; design; Electronics
Packaging; frequency response; frequency-; integrated
circuit chips; integrated circuit manufacture ---
Thermal Effects; integrated circuits, VLSI; inverse
Fast Fourier Transform; magnetic pins; magnetic
property; measurement; module pins; nonmagnetic
coating; nonmagnetic conductive material; nonmagnetic
pins; packaging; performance; pin inductance; signal
behavior; signal degradation; theory; time-domain
solution; transmission line modules; uncoated module
pins; VLSI; VLSI packaging",
subject = "C.5.4 Computer Systems Organization, COMPUTER SYSTEM
IMPLEMENTATION, VLSI Systems \\ B.7.1 Hardware,
INTEGRATED CIRCUITS, Types and Design Styles, VLSI
(very large scale integration) \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS",
treatment = "A Application; P Practical; T Theoretical or
Mathematical; X Experimental",
}
@Article{Astesiano:1987:DSC,
author = "Egidio Astesiano and Gianna Reggio",
title = "Direct semantics of concurrent languages in the
{SM}o{LCS} approach",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "512--534",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "For years providing syntax-directed methods for the
formal definition of concurrent languages has proved to
be a challenging task. Problems are even more difficult
if a language has some of the typical Ada features,
such as strong interference between sequential and
concurrent aspects, parameterized semantics, complex
data structure, and an extremely large size. We have
developed an approach, the SMoLCS approach, which
extends the denotational method to handle concurrent
languages and provides a solution to the above
problems. Our method has been adopted for the formal
definition of full Ada within the related EEC project.
We illustrate the basic principles of the approach,
following the so-called direct semantics style used for
Ada with the help of a toy language as a running
example.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C6140D (High level languages);
C6150C (Compilers, interpreters and other processors)",
classification = "721; 723",
corpsource = "Dept. of Math., Genoa Univ., Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Ada; automata theory --- Computational Linguistics;
computer programming languages; concurrent languages;
definition of full Ada; denotational method; design;
direct semantics; EEC project; example; formal; formal
definition; high level languages; languages; methods;
parallel programming; Performance; semantics; SMoLCS
approach; syntax-directed; syntax-directed methods;
theory; toy language",
subject = "D.4.1 Software, OPERATING SYSTEMS, Process Management,
Concurrency \\ D.3.3 Software, PROGRAMMING LANGUAGES,
Language Constructs, Concurrent programming structures
\\ D.3.1 Software, PROGRAMMING LANGUAGES, Formal
Definitions and Theory, Semantics \\ D.3.2 Software,
PROGRAMMING LANGUAGES, Language Classifications \\
F.3.2 Theory of Computation, LOGICS AND MEANINGS OF
PROGRAMS, Semantics of Programming Languages,
Denotational semantics",
treatment = "A Application; P Practical; T Theoretical or
Mathematical",
}
@Article{Woodcock:1987:TPP,
author = "J. C. P. Woodcock",
title = "Transaction Processing Primitives and {CSP}",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "535--545",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Several primitives for transaction processing systems
are developed using the notations of Communicating
Sequential Processes. The approach taken is to capture
each requirement separately, in the simplest possible
context: The specification is then the conjunction of
all these requirements. As each is developed as a
predicate over traces of the observable events in the
system, it is also implemented as a simple
communicating process; the implementation of the entire
system is then merely the parallel composition of these
processes. The laws of CSP are then used to transform
the system to achieve the required degree of
concurrency, to make it suitable for execution in a
multiple-tasking system, for example. There is a
discussion of how state-based systems may be developed
using this approach together with some appropriate
notation for specifying and refining data structures
and operations upon them and of how the system may be
implemented. This work is intended as a case study in
the use of CSP.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C6150J (Operating
systems)",
classification = "721; 731",
corpsource = "Comput. Lab., Oxford Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automata theory; case study; Communicating Sequential;
communicating sequential processes; computer
metatheory; computer programming; concurrency; data
structures; design; multiple-tasking system;
multiprogramming; parallel composition; primitives and
CSP; Processes; state-based; systems; theory;
transaction processing; transaction processing
primitives; transaction processing systems",
subject = "D.1.3 Software, PROGRAMMING TECHNIQUES, Concurrent
Programming, CSP \\ F.3.3 Theory of Computation, LOGICS
AND MEANINGS OF PROGRAMS, Studies of Program
Constructs, Control primitives \\ H.2.4 Information
Systems, DATABASE MANAGEMENT, Systems, Transaction
processing",
treatment = "T Theoretical or Mathematical",
}
@Article{Morgan:1987:SSR,
author = "Carroll Morgan and Ken Robinson",
title = "Specification Statements and Refinement",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "546--555",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68N05",
MRnumber = "922 164",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We discuss the development of executable programs from
state-based specifications written in the language of
first-order predicate calculus. Notable examples of
such specifications are those written using the
techniques Z and VDM; but our interest is in the
derivation of the algorithms from which they
deliberately abstract. This is, the role of a
development method. We propose a development method
based on specification statements with which
specifications are embedded in programs --- standing in
for developments `yet to be done.' We show that
specification statements allow description,
development, and execution to be carried out within a
single language: programs\slash specifications become
hybrid constructions in which both predicates and
directly executable operations can appear. The use of a
single language --- embracing both high-and low-level
constructs --- has a considerable influence on the
development style, and it is that influence we discuss:
the specification statement is described, its
associated calculus of refinement is given, and the use
of that calculus is illustrated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110 (Systems analysis and programming)",
classification = "723",
corpsource = "Comput. Lab., Oxford Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Algorithms; associated; calculus of
refinement; computer metatheory; computer programming;
design; development method; development of executable
programs; examples; executable programs; hybrid
constructions; language of first-order predicate
calculus; languages; predicate calculus;
programs/specifications; rigorous derivation; single
language; software engineering; specification
statements; specifications; state-based; state-based
specifications; theory; VDM; verification; Z",
subject = "F.3.1 Theory of Computation, LOGICS AND MEANINGS OF
PROGRAMS, Specifying and Verifying and Reasoning about
Programs \\ D.3.1 Software, PROGRAMMING LANGUAGES,
Formal Definitions and Theory \\ D.2.1 Software,
SOFTWARE ENGINEERING, Requirements/Specifications",
treatment = "T Theoretical or Mathematical",
}
@Article{Smolka:1987:CSN,
author = "Scott A. Smolka and Robert E. Strom",
title = "A {CCS} semantics for {NIL}",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "556--570",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We present a syntax-directed translation of NIL, a
high-level language for distributed systems
programming, into CCS, Milner's Calculus of
Communicating Systems. This translation presents unique
problems because of NIL's highly dynamic nature, and
makes full use of CCS's descriptive facilities. We
consider NIL constructs for dynamic creation and
deletion of processes and communication channels,
queued synchronous and asynchronous message passing,
nondeterministic message selection, and exception
handling. A NIL implementation of a simple command
shell is used to illustrate the translation procedure.
We discuss various issues and open problems concerning
the suitability of CCS as an abstract semantics for
NIL.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6150J (Operating
systems)",
classification = "721; 723",
corpsource = "Dept. of Comput. Sci., State Univ. of New York, Stony
Brook, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abstract; automata theory; Calculus of; CCS semantics;
Communicating Systems; compilers; computer operating
systems --- Program Translators; computer programming
languages; design; distributed processing; distributed
systems programming; high level languages; high-;
high-level language; languages; level language; message
passing; nil constructs; program; semantics;
syntax-directed translation; syntax-directed
translation of NIL; theory; translation procedure",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, NIL \\ D.2.1 Software, SOFTWARE
ENGINEERING, Requirements/Specifications, CCS \\ F.4.3
Theory of Computation, MATHEMATICAL LOGIC AND FORMAL
LANGUAGES, Formal Languages, CCS \\ F.3.2 Theory of
Computation, LOGICS AND MEANINGS OF PROGRAMS, Semantics
of Programming Languages",
treatment = "G General Review",
}
@Article{Ciskowski:1987:SIE,
author = "R. D. Ciskowski and C. H. Liu and H. H. Ottesen and S.
U. Rahman",
title = "System Identification: an Experimental Verification",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "571--584",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "System Identification may be defined as the process of
determining a model of a dynamic system using observed
system input-output data. The identification of dynamic
systems through the use of experimental data is
important in engineering since it provides information
about system parameters which is useful in predicting
behavior and evaluating performance. Traditional
methods of System Identification are usually
time-consuming, costly, and difficult to use in other
than a product development environment. Within the last
decade, more sophisticated techniques for system
identification have been developed that can
simultaneously estimate many parameters accurately and
repeatedly. These modern techniques are efficient, easy
to use, inexpensive, and adaptable to manufacturing and
in-the-field environments where they can be used to
evaluate product quality and performance. This paper
describes the use of one such system identification
algorithm to estimate several mechanical parameters of
8-inch hard-disk drive spindles in a manufacturing-like
setting.",
acknowledgement = ack-nhfb,
affiliation = "IBM, USA",
affiliationaddress = "IBM, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170L (Inspection and quality control); C1220
(Simulation, modelling and identification); C5320C
(Storage on moving magnetic media); C7440 (Civil and
mechanical engineering)",
classification = "721; 722; 731; 913",
corpsource = "IBM Syst. Products Div., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "8-inch hard-disk drive spindles; algorithms; behavior;
computing; control systems --- Identification; data;
data storage, magnetic --- Disk; design; dynamic
systems; environment; evaluating; evaluating
performance; experimental verification;
experimentation; hard discs; hard-disk drive;
identification; Identification; identification of
dynamic systems; in-the-field environments;
input-output data; manufacturing environment;
measurement; mechanical; mechanical engineering;
observed system input-output; parameters; performance;
predicting; product development; product quality;
production control; quality control; system
identification; systems science and cybernetics;
verification",
subject = "H.1.1 Information Systems, MODELS AND PRINCIPLES,
Systems and Information Theory, General systems theory
\\ C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Klokholm:1987:DFT,
author = "Erik Klokholm",
title = "Delamination and Fracture of Thin Films",
journal = j-IBM-JRD,
volume = "31",
number = "5",
pages = "585--591",
month = sep,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The fracture and delamination of thin films is a
relatively common occurrence, and prevention of these
mechanical failures is essential for the successful
manufacture of thin-film devices. Internal elastic
stresses are an inherent part of the thin-film
deposition process, and are largely responsible for the
mechanical failures of thin films. However, it is not
the magnitude of the film stress S which governs film
fracture or delamination, but the elastic energy U
stored in the film. This presentation shows that the
mechanical stability of the film and the substrate
requires that U be less than a critical value U$_c$ and
that U$_c$ is dependent upon the surface energy
gamma.",
acknowledgement = ack-nhfb,
affiliation = "IBM, USA",
affiliationaddress = "IBM, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6860 (Physical properties of thin films,
nonelectronic); B2220E (Thin film circuits)",
classification = "421; 539; 931",
corpsource = "IBM Corp., Thornwood, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "delamination; delamination of thin films; design;
elasticity --- Thin Films; Failure; film delamination;
film deposition process; film fracture; films; fracture
mechanics; fracture of thin; internal elastic stresses;
measurement; mechanical; mechanical failures;
mechanical stability; performance; stability; stored
elastic energy; surface energy; thin film devices; thin
films; thin-; thin-film deposition; thin-film devices",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies",
treatment = "T Theoretical or Mathematical",
}
@Article{Geffken:1987:CMD,
author = "Robert M. Geffken and James G. Ryan and George J.
Slusser",
title = "Contact Metallurgy Development for {VLSI} Logic",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "608--616",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The criteria involved with the choice of an ohmic
contact material for VLSI logic are discussed. The
problems of aluminum penetration encountered with Al
metallization and solid-phase epitaxy associated with
Al-Si metallization make these interconnect materials
incompatible with VLSI technology. The contact
resistance characteristics of palladium and platinum
silicides were compared to the contact resistance
obtained using a titanium contact layer. The contact
resistance of palladium silicide increased with
extended annealing at 400 degree C, while the PtSi and
Ti contact materials exhibited stable contact
resistance under these conditions. A Ti\slash
Al-Cu\slash Si process which is compatible with a
lift-off patterning technique and partial coverage of
contacts is described. Rutherford backscattering
results indicate that copper and silicon additions to
the aluminum metallization retard the Ti-Al reaction.
SIMS data show that silicon in Ti\slash Al-Cu\slash Si
films redistributes during heat treatment, accumulating
at the Ti\slash Al-Cu interface.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340N (Metal-nonmetal contacts); B0530 (Metals and
alloys); B2530D (Semiconductor-metal interfaces);
B2550F (Metallisation); B2570 (Semiconductor integrated
circuits)",
classification = "531; 539; 541; 713; 714; 721",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al; AlSi; aluminum and alloys --- Metallizing;
aluminum penetration; backscattering results; contact;
contact metallurgy; contact resistance; Contacts;
contacts; design; heat treatment; integrated circuit
technology; integrated circuits, VLSI; interconnect
materials; lift-off patterning; logic devices;
metallisation; metallization; ohmic; ohmic contact
material; palladium compounds; partial coverage of
contacts; Pd$_2$Si; platinum compounds; PtSi; resistant
characteristic; Rutherford; Rutherford backscattering;
selection criteria; silicides; SIMS data; solid-phase
epitaxy; technique; Ti contact materials; Ti-AlCu-Si;
titanium; VLSI; VLSI logic",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ C.4
Computer Systems Organization, PERFORMANCE OF SYSTEMS,
Design studies \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Electronics",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Stork:1987:EMI,
author = "J. M. C. Stork and E. Ganin and J. D. Cressler and G.
L. Patton and G. A. Sai-Halasz",
title = "Electrical and Microstructural Investigation of
Polysilicon Emitter Contacts for High-Performance
Bipolar {VLSI}",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "617--626",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Key electrical characteristics of polysilicon emitter
contacts in bipolar transistors, such as contact
resistance and recombination velocity, are sensitive to
the microstructure of the polysilicon\slash
single-crystal silicon interface. We correlated the
microstructural and electrical characteristics of this
interface by performing cross-sectional transmission
electron microscopy (XTEM) on actual transistors on the
same chip where ring-oscillator speeds were measured.
The base current and emitter resistance of the fastest
devices approached values typical of single-crystal
silicon emitters. Interpretation of these electrical
data and of the SIMS impurity profile indicates that
significant restructuring of the polysilicon\slash
single-crystal interface had taken place. This
conclusion was confirmed by the XTEM results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2520C (Elemental
semiconductors); B2530B (Semiconductor junctions);
B2550 (Semiconductor device technology); B2560J
(Bipolar transistors); B2570B (Bipolar integrated
circuits)",
classification = "549; 701; 713; 714; 933",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktowm Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "actual transistors; base current; bipolar integrated
circuits; bipolar transistors; bipolar VLSI; contact
resistance; cross-sectional; crystal Si; crystals;
design; Electric Properties; electrical data; electron
microscopy; elemental; emitter contacts; emitter
resistance; fastest devices; high-performance;
integrated; integrated circuit technology; integrated
circuits, VLSI; junctions; key electrical
characteristics; logic circuits; measurement;
microstructural investigation; microstructure;
performance; polycrystal Si-single; polycrystalline Si
emitter contacts; polysilicon; recombination velocity;
ring-oscillator speeds; secondary ion mass spectra;
semiconducting silicon; semiconductor; semiconductor
technology; semiconductors; silicon; SIMS impurity
profile; transistors, bipolar; transmission;
transmission electron microscopy; VLSI; XTEM",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS, Design studies",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Taur:1987:SCS,
author = "Y. Taur and B. Davari and D. Moy and J. Y.-C. Sun and
C. Y. Ting",
title = "Study of Contact and Shallow Junction Characteristics
in Submicron {CMOS} with Self-Aligned Titanium
Silicide",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "627--633",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The contact resistance between TiSi$_2$ and shallow
n** plus /p** plus source-drains in CMOS is studied for
a variety of junction depths and silicide thicknesses.
The contact contribution to the total device series
resistance can be significant if excessive silicon and
dopants are consumed during silicide formation. Low
contact resistances are obtained for 0.15-$\mu$m n**
plus and 0.20-$\mu$m p** plus junctions when the
titanium thickness is reduced to keep a high doping
concentration at the TiSi$_2$/Si interface.
Alternatively, a nonstandard process can be employed to
implant additional dopants into the titanium. A thin
layer of dopants then out-diffuses into the silicon
after the silicide reaction and anneal to help reduce
contact resistance and leakage currents. The latter
technique is more extendable to CMOS devices which
require thicker titanium films and\slash or shallower
junctions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2530B (Semiconductor junctions); B2570D (CMOS
integrated circuits)",
classification = "542; 549; 701; 712; 713; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "$n^+p^+$ source-drains; 150 nm; 200 nm;
characteristics; CMOS integrated circuits; contact
contribution; contact resistance; design; doping
concentration; implant additional dopants; integrated
circuit manufacture; integrated circuit technology;
interface; junction depths; leakage currents;
measurement; nonstandard process; of dopants;
Performance; performance; scaling; self-aligned
TiSi$_2$; semiconductor devices, MOS; semiconductor
materials; series resistance; shallow; shallow
junction; silicide; submicron CMOS; thicknesses; thin
layer; TiSi/sub 2/-Si; titanium and alloys; titanium
compounds; titanium silicide",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Memory technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS, Design studies",
treatment = "A Application; B Bibliography; P Practical; X
Experimental",
}
@Article{Krusin-Elbaum:1987:OSC,
author = "L. Krusin-Elbaum and R. V. Joshi",
title = "Oxidation of {Si-Rich} Chemical-Vapor-Deposited Films
of Tungsten Silicide",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "634--640",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have studied dry oxidation characteristics of
Si-rich WSi$_x$ thin films prepared by LPCVD directly
on SiO$_2$, with x equals 2.7 for as-deposited films.
It has been reported previously that thin (less than
100 nm) CVD tungsten silicide adheres well to SiO$_2$.
Using Auger depth profiling and Rutherford
backscattering spectroscopies, we find that silicon in
excess of stoichiometric WSi$_2$ diffuses through the
silicide toward the surface to form a SiO$_2$
passivating overlayer. The extracted activation energy
for this oxidation process is E$_a$ equals 1.2 eV,
consistent with oxygen diffusion in SiO$_2$. A similar
value of E$_a$ is found for WSi$_x$ deposited on
polysilicon. During the anneal, the stoichiometry x of
WSi$_x$ decreases monotonically with the annealing
temperature, reaching x equals 2 after 30 min at 900
degree C or 20 min at 950 degree C. Longer times or
higher temperatures result in silicon depletion, with x
equals 1.7 after 30 min at 1000 degree C.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B2550E (Surface
treatment); B2550G (Lithography)",
classification = "543; 549; 712; 714; 804",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1.2; 30 min; 500 nm; 900 C; activation energy;
annealing; annealing temperature; Auger depth
profiling; beam lithography; Chemical Vapor Deposition;
chemical vapour deposition; CVD coatings; design; dry
oxidation; dry oxidation characteristics; e-; eV;
experimentation; FET processing sequence; films; gate
electrode; homogenization anneal; homogenization steps;
integrity of fine line structures; LPCVD; LPCVD direct
on; measurement; oxidation; oxidation processes;
passivating overlayer; performance; reoxidation;
resistivity; Rutherford backscattering; scaling;
scanning electron micrograph; SEM; semiconducting
silicon; semiconductor materials; semiconductor
technology; Si-rich chemical-vapor-deposited; SiO$_2$;
SIO/sub 2/; spectroscopies; standard; stoichiometry;
submicron VLSI; tungsten and alloys --- Oxidation;
tungsten silicide; vertical profiles; WSi$_x$ thin
films; WSi$_x$-SiO$_2$",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS, Design studies",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Stapper:1987:CAP,
author = "C. H. Stapper",
title = "Correlation Analysis of Particle Clusters on
Integrated Circuit Wafers",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "641--650",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Defect clustering results in correlations between the
numbers of defects or faults that occur on integrated
circuit chips located adjacent to one another on
semiconductor wafers. Until now, it has been believed
that correlations of this type were not accounted for
in existing yield models. It is shown that such
correlations are present in yield models based on mixed
or compound Poisson statistics. A quadrat analysis of
particle distributions on semiconductor wafers is used
to compare data and theory. The results show that the
theoretical correlation coefficients are in agreement
with the experimental ones. It was also determined from
the particle data how these correlation coefficients
vary as the distance between quadrats is increased.
This variation provides a convenient method for
determining the cluster dimensions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B2570
(Semiconductor integrated circuits)",
classification = "713; 714; 922",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "compound Poisson; correlation analysis; defect
clustering; Defects; design; integrated circuit chips;
integrated circuit manufacture; integrated circuit
wafers; measurement; particle clusters; particle
distributions; performance; Poisson statistics; quadrat
analysis; reliability; semiconductor technology;
semiconductor wafers; statistical methods; statistics;
theoretical correlation coefficients; theory; wafers;
yield models",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ B.7.m Hardware, INTEGRATED CIRCUITS,
Miscellaneous \\ G.3 Mathematics of Computing,
PROBABILITY AND STATISTICS \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "T Theoretical or Mathematical",
}
@Article{Goyal:1987:MAC,
author = "Ambuj Goyal and Stephen S. Lavenberg",
title = "Modeling and Analysis of Computer System
Availability",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "651--664",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The quantitative evaluation of computer-system
availability is becoming increasingly important in the
design and configuration of commercial computer
systems. This paper deals with methods for constructing
and solving large Markov-chain models of
computer-system availability. A set of powerful
high-level modeling constructs is discussed that can be
used to represent the failure and repair behavior of
the components that comprise a system, including
important component interactions, and the repair
actions that are taken when components fail. If
time-independent failure and repair tests are assumed,
then a time-homogeneous continuous-time Markov chain
can be constructed automatically from the modeling
constructs used to describe the system. Markov chains
having tens of thousands of states can be readily
constructed in this manner. Techniques that are
particularly suitable for numerically solving such
large Markov chains are discussed, including techniques
for computing the sensitivities of availability
measures with respect to model parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); C0310H (Equipment and software
evaluation methods); C1210B (Reliability theory)",
classification = "722; 723; 913; 922",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automatic Markov-; behavior; chain
construction; commercial computer systems; component
interactions; computer system availability; computer
system modeling; computer systems, digital;
computer-system availability; design; example; failure
and repair; fault tolerant computing; high-level
modeling; high-level modeling constructs; languages;
Markov-chain models; Mathematical Models; measurement;
model-solution methods; modeling constructs; models;
performance; probability; program package; quantitative
evaluation; reliability; reliability theory; repair
rates; SAVE; solving large Markov-chain; System
Availability Estimator; tens of thousands of states;
time-homogeneous continuous-time Markov chain;
time-independent failure",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS, Modeling techniques \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS, Reliability,
availability, and serviceability \\ B.1.4 Hardware,
CONTROL STRUCTURES AND MICROPROGRAMMING, Microprogram
Design Aids, Languages and compilers \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "G General Review",
}
@Article{Scoggin:1987:F,
author = "Donald M. Scoggin and James E. {Hall, Jr.}",
title = "Ferroresonance",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "665--678",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a mathematical model for
ferroresonant circuits that addresses some of the
deficiencies of earlier analyses of ferroresonant
regulators. Derived using piecewise-linear, normalized
differential equations, the model accommodates
nonlinear behavior and predicts circuit performance in
terms of parameters such as line voltage, frequency,
and load. A phase-plane analysis is used to simplify
the determination of linear regions of operation
between nonlinear events. Numerical solutions of the
resulting equations are used to generate time-domain
and parametric performance curves. The results compare
well with experiments and suggest potential
applications in the design of high-frequency voltage
regulators.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1210 (Power electronics, supply and supervisory
circuits); C3110B (Voltage); C3220 (Controllers);
C3340H (Electric systems)",
classification = "706; 713; 715",
corpsource = "IBM Corp., Research Triangle Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "behavior; deficiencies of; design; design of high-;
earlier analyses; electronic circuits; experimentation;
ferromagnetic resonance; ferroresonance; ferroresonant
circuits; ferroresonant regulators; frequency;
frequency voltage regulators; high-frequency voltage
regulators; line; line voltage; linear; load;
mathematical model; measurement; nonlinear; normalized
differential equations; parameters; parametric;
performance; performance curves; phase-plane analysis;
piecewise-; potential applications; predicts circuit
performance; Resonance; theory; voltage; voltage
control; voltage regulators; voltage regulators ---
Design",
subject = "G.m Mathematics of Computing, MISCELLANEOUS \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics",
treatment = "A Application; X Experimental",
}
@Article{Zable:1987:FDH,
author = "J. L. Zable and H. C. Lee",
title = "Font Design for High-Speed Impact Line Printers",
journal = j-IBM-JRD,
volume = "31",
number = "6",
pages = "679--683",
month = nov,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In impact line printers that use print-band (or
similar) technology, the higher speed required of the
type band for higher print throughput results in wide
printed strokes with increased slur. Ordinarily, font
designers compensate for the increased printed
strokewidth by narrowing the width of the engraved
characters on the type band. While this approach
corrects the total printed character stroke, the print
quality is degraded because of increased slur. This
paper presents an alternative design approach in which
an examination of the essential parameters of print
dynamics suggests a font design that incorporates wider
strokewidths.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)",
classification = "722; 745",
corpsource = "IBM Syst. Products Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer peripheral equipment; design; essential
parameters; font; font design; high-speed impact line
printers; impact line printers; print band printer;
print dynamics; print quality; print throughput;
printed strokes; printers; Printers; printing machinery
--- Performance; slur; strokewidths; theory; wider
strokewidths",
subject = "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
Input/Output Devices, Data terminals and printers \\
G.m Mathematics of Computing, MISCELLANEOUS",
treatment = "A Application; P Practical; T Theoretical or
Mathematical; X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Wheeler:1988:WSS,
author = "John Archibald Wheeler",
title = "World as System Self-Synthesized by Quantum
Networking",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "4--15",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The quantum, strangest feature of this strange
universe, cracks the armor that conceals the secret of
existence. In contrast to the view that the universe is
a machine governed by some magic equation, we explore
here the view that the world is a self-synthesizing
system of existences, built on observer-participancy
via a network of elementary quantum phenomena. The
elementary quantum phenomenon in the sense of Bohr, the
elementary act of observer-participancy, develops
definiteness out of indeterminism, secures a
communicable reply in response to a well-defined
question. The rate of carrying out such yes-no
determinations, and their accumulated number, are both
minuscule today when compared to the rate and number to
be anticipated in the billions of years yet to come.
The coming explosion of life opens the door, however,
to an all-encompassing role for observer-participancy:
to build, in time to come, no minor part of what we
call its past --- our past, present, and future --- but
this whole vast world.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0365 (Quantum theory; quantum mechanics); A0370
(Theory of quantized fields)",
classification = "931",
corpsource = "Dept. of Phys., Texas Univ., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "continuum of number theory; delayed choice experiment;
elementary quantum; elementary quantum phenomena;
explosion of life; indeterminancy; indeterminism;
network of elementary quantum phenomena; observer
participancy; observer-participancy; phenomenon;
quantum networking; quantum theory; role for; self-;
self-synthesized systems; synthesizing system of
existences; theory; world as self synthesizing system",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics",
treatment = "T Theoretical or Mathematical",
}
@Article{Bennett:1988:NHR,
author = "Charles H. Bennett",
title = "Notes on the History of Reversible Computation",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "16--23",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "01A60 (68-03 81C99 94A15)",
MRnumber = "89i:01045",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Basic concepts in quantum and stochastic transport.",
abstract = "We review the history of the thermodynamics of
information processing, beginning with the paradox of
Maxwell's demon; continuing through the efforts of
Szilard, Brillouin, and others to demonstrate a
thermodynamic cost of information acquisition; the
discovery by Landauer of the thermodynamic cost of
information destruction; the development of theory of
and classical models for reversible computation; and
ending with a brief survey of recent work on quantum
reversible computation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4200 (Computer theory)",
classification = "641",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "billiard-ball computation model; classical models;
computation theory; cost of information destruction;
design; history; information processing; paradox of
Maxwell's demon; quantum; quantum reversible
computation; reversible computation; theory;
thermodynamic; thermodynamic cost of information
acquisition; thermodynamic cost of information
destruction; thermodynamics; thermodynamics of",
subject = "H.1.1 Information Systems, MODELS AND PRINCIPLES,
Systems and Information Theory \\ G.m Mathematics of
Computing, MISCELLANEOUS",
treatment = "G General Review",
}
@Article{Keyes:1988:MEL,
author = "R. W. Keyes",
title = "Miniaturization of Electronics and its Limits",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "24--28",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The long-continued advance of the performance of
information processing technologies has been based on
miniaturization of components. The history of
miniaturization is presented through examples. They
suggest that limits proposed by Landauer in the 1960s
will be reached in two or three decades.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0140 (Administration and management); B1265D (Memory
circuits); B2570 (Semiconductor integrated circuits);
C0200 (General computer topics); C5320 (Digital
storage)",
classification = "713; 714",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "design; digital storage; electronics miniaturization;
history; history of miniaturization; information
processing technologies; integrated circuit technology;
Landauer limits; limitations; limits of
miniaturization; microelectronics; miniaturization
history; miniaturization of components; miniaturization
of electronics; physical limits; solid state devices;
technological forecasting",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.m Hardware,
MISCELLANEOUS",
treatment = "G General Review",
}
@Article{Toffoli:1988:ITO,
author = "Tommaso Toffoli",
title = "Information Transport Obeying the Continuity
Equation",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "29--36",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A15 (82A99)",
MRnumber = "89j:94013",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Basic concepts in quantum and stochastic transport.",
abstract = "We analyze nontrivial dynamical systems in which
information flows as an additive conserved quantity ---
and thus takes on a strikingly tangible aspect. To
arrive at this result, we first give an explicit
characterization of equilibria for a family of lattice
gases.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); C1260 (Information
theory)",
classification = "921; 931",
corpsource = "Lab. for Comput. Sci., MIT., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "additive conserved; continuity equation; dynamical
systems; dynamics; information flows; information
theory; information transport; lattice gases; mass and
information perturbations; nontrivial; nontrivial
dynamic systems; quantity; small perturbations from
equilibrium; tangible aspect; theory",
reviewer = "Masanori Ohya",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics \\ G.2.m Mathematics of Computing,
DISCRETE MATHEMATICS, Miscellaneous",
treatment = "T Theoretical or Mathematical",
}
@Article{Kuhn:1988:OLP,
author = "Hans Kuhn",
title = "Origin of Life and Physics: Diversified Microstructure
--- Inducement to Form Information-Carrying and
Knowledge-Accumulating Systems",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "37--46",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The process leading to the origin and evolution of
life is caused by the presence of distinct physical and
chemical conditions at a distinct location in the
universe. A specified system originates and evolves
under the continuous influence of a complex operational
environment. The system develops toward increasing
independence of the original environment by becoming
increasingly complex. Modeling a detailed scenario
consisting of a sequence of reasonable physico-chemical
steps is essential in rationalizing the phenomenon. The
basic process, accumulation of knowledge by
continuously testing environmental properties, is
intimately related to the measuring process in physics.
Evolution is a physical process, and this process leads
to man developing physics. Thus physics appears to be
self-consistent --- the basis and consequence of
evolution. The physics-producing system is considered
to be a measuring and information-processing device
based upon the mechanism which operates in the origin
and evolution of life.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); C1260 (Information
theory)",
classification = "931; 932",
corpsource = "Max-Plank-Inst. for Biophys. Chem., Gottingen, West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accumulation of knowledge; becoming increasingly
complex; chemical steps; complex; continuous influence;
diversified microstructure; evolution of life;
independence; information carrying systems; information
theory; information-carrying and knowledge-accumulating
systems; information-processing device;
knowledge-accumulating; Landauer's modulated potential
computer; Landauer's self-consistency; operational
environment; origin of; origin of life; origin of life
and physics; physico-; physico-chemical steps; physics;
physics-producing; system; system develops toward
increasing; systems; theory",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics \\ H.1.1 Information Systems,
MODELS AND PRINCIPLES, Systems and Information Theory,
General systems theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Erdos:1988:DSO,
author = "Paul Erdos",
title = "Density of States of One-Dimensional Random
Potentials",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "47--51",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Following an introduction to the early history of the
theories of the density of electronic states in
one-dimensional structures, pioneered, among others, by
R. Landauer and J. C. Helland, a particular model, that
of a multistep random potential, is discussed. It is
shown that Kolmogorov-type equations can be obtained
for the probability distribution of the phase of the
wave function, and, by solving these equations, the
density of states may be calculated. An analogy with
the classical rotator in a random force field is worked
out, and helps in visualizing the results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7110 (General theories and computational techniques);
A7120A (Developments in mathematical and computational
techniques)",
classification = "921; 931",
corpsource = "Inst. of Theor. Phys., Lausanne Univ., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "classical rotator; density of electronic states;
electronic density of states; field; Kolmogorov-type
equations; Molecular; multistep random potential;
one-dimensional random potentials; one-dimensional
structures; physics; probability distribution; random
force; rotator model; stationary probability densities;
theory; two-step random potential; wave function phase;
wave function probability distribution",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ G.m Mathematics of
Computing, MISCELLANEOUS",
treatment = "T Theoretical or Mathematical",
}
@Article{Azbel:1988:BEM,
author = "Mark Ya. Azbel",
title = "{Bloch} Electron in a Magnetic Field: Mixed
Dimensionality and the Magnetic-Field-Induced
Generalized Quantum {Hall} Effect",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "52--57",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The energy spectrum of a Bloch electron in a magnetic
field is one-dimensional. This leads to the Peierls
instability and the magnetic-field-induced transition
to the quantized Hall effect. The wave function is
two-dimensional. This decreases the Peierls gap and
makes it exponentially vanishing with magnetic field.
Disorder lifts the degeneracy and one-dimensionality of
the spectrum. High disorder yields a metallic behavior.
Intermediate disorder leads to the generalized
quantized Hall effect. The latter has a finite
magnetoresistance as a semimetal, and Hall plateaus
similar to the quantized ones, but they may have any
value of the effective charge.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7215N (Collective modes; low-dimensional conductors);
A7220M (Galvanomagnetic and other magnetotransport
effects)",
classification = "701; 921; 931; 932",
corpsource = "Dept. of Phys., Tel-Aviv Univ., Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Bloch electron; electrons; experimentation; hall
effect; magnetic fields; magnetic-field-induced
generalized quantum Hall effect; metal-GHE-GQHE phase
diagram; mixed dimensionality; Peierls instability;
Schr{\"o}dinger equation; theory; Peierls instability;
quantum Hall effect; Bloch electron in magnetic field;
two dimensional wave; function; disorder effects; Bloch
electron; mixed; dimensionality; magnetic-field-induced
generalized quantum; Hall effect; energy spectrum;
Peierls instability; magnetic-; field-induced
transition; quantized Hall effect; Peierls; gap;
exponentially vanishing with magnetic field;
degeneracy; one-dimensionality; metallic behaviour;
finite; magnetoresistance; semimetal; Hall plateaus",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ G.m Mathematics of
Computing, MISCELLANEOUS",
treatment = "T Theoretical or Mathematical",
}
@Article{Sorbello:1988:RRD,
author = "R. S. Sorbello and C. S. Chu",
title = "Residual Resistivity Dipoles, Electromigration, and
Electronic Conduction in Metallic Microstructures",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "58--62",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "For an impurity in a bulk metal, the connection
between electromigration and electric fields associated
with DC conductivity is understood in terms of
Landauer's residual resistivity dipole. This connection
is examined, and appropriate generalizations are made
for an impurity in a two-dimensional electron gas and
for an impurity near a metal surface. The residual
resistivity dipole field decays less rapidly with
distance in a two-dimensional gas than in bulk, thus
resulting in a larger voltage drop across an impurity
in the system of lower dimensionality.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630Q (Electromigration); A7145 (Collective effects);
A7210 (Theory of electronic transport; scattering
mechanisms)A7215 (Electronic conduction in metals and
alloys)",
classification = "531; 921; 931",
corpsource = "Wisconsin Univ., Milwaukee, WI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bulk metal; bulk metals; conduction; DC conductivity;
dipole; electric; electrical conductivity of solids;
electromigration; electron gas; electronic; electronic
conduction; Electronic Properties; fields;
generalizations; impurities; impurity in 2D electron
gas; impurity in bulk metal; impurity near metal
surface; Landauer's residual resistivity; Landauer's
residual resistivity dipole; larger voltage; metallic
microstructures; metals and alloys; residual
resistivity dipole field; residual resistivity dipoles;
theory; two-dimensional electron gas",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ G.m Mathematics of
Computing, MISCELLANEOUS",
treatment = "T Theoretical or Mathematical",
}
@Article{Buttiker:1988:CST,
author = "M. Buttiker",
title = "Coherent and Sequential Tunneling in Series Barriers",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "63--75",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A simple approach which can describe both coherent
tunneling and sequential tunneling is applied to
resonant tunneling through a double-barrier structure.
This approach models phase-randomizing events by
connecting to the conductor a side branch leading away
from the conductor to a reservoir. The reservoir does
not draw or supply a net current, but permits inelastic
events and phase randomization. A conductance formula
is obtained which contains contributions due to both
coherent and sequential tunneling. We discuss the
limiting regimes of completely coherent tunneling and
completely incoherent transmission, and discuss the
continuous transition between the two. Over a wide
range of inelastic scattering times tunneling is
sequential. The effect of inelastic events on the
peak-to-valley ratio and the density of states in the
resonant well is investigated. We also present an
analytic discussion of the maximum peak conductance e/
H D-BAR of an isolated resonance in a many-channel
conductor.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340G (Tunnelling: general); B2530 (Semiconductor
junctions and interfaces)",
classification = "714; 921",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analytic; Brett and Wigner formulae; Charge Carriers;
coherent and sequential tunneling; coherent tunneling;
completely coherent tunneling; completely incoherent;
conductance formula; continuous transition; density of
states; discussion; double-barrier structure; effect of
inelastic events; inelastic scattering times; isolated
resonance; limiting regimes; many-channel conductor;
maximum peak conductance; models; peak-to-valley; phase
randomization; phase-; randomizing events; range of
inelastic; ratio; resonant tunneling; resonant well;
scattering times; semiconductor materials; sequential
tunneling in series barriers; series barriers; theory;
transmission; tunnelling",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics \\ G.m Mathematics of Computing,
MISCELLANEOUS",
treatment = "T Theoretical or Mathematical",
}
@Article{Fisher:1988:DEE,
author = "Michael E. Fisher",
title = "Diffusion from an Entrance to an Exit",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "76--81",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "82A31 (39A10 82-01 82A41)",
MRnumber = "89d:82049",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "Basic concepts in quantum and stochastic transport.",
abstract = "Asymptotic and exact solutions are derived from first
principles by various methods for the moments of the
number of steps or traversal time, etc., of a particle
which diffuses, most specifically on a linear chain, to
an exit site without previously leaving via an entrance
site. The presentation is expository and uses standard
methods.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0250 (Probability theory, stochastic processes, and
statistics); A0540 (Fluctuation phenomena, random
processes, and Brownian motion); A0550 (Lattice theory
and statistics; Ising problems); A0560 (Transport
processes: theory)",
classification = "921; 931; 932",
corpsource = "Inst. of Phys. Sci. and Technol., Maryland Univ.,
College Park, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "asymptotic/exact solutions; avoidance formula
evaluation; derived from first principles; diffusion;
diffusion from an entrance to an exit; diffusion on
chain; exact solutions; first visits with avoidance;
lattice theory and statistics; linear chain; number of;
particle beams; pausing walk on chain; probability;
random processes; standard methods; steps; stochastic
processes; theory; traversal time",
subject = "G.3 Mathematics of Computing, PROBABILITY AND
STATISTICS \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Physics",
treatment = "T Theoretical or Mathematical",
}
@Article{Cohen:1988:BTP,
author = "M. H. Cohen and M. Y. Chou and E. N. Economou and S.
John and C. M. Soukoulis",
title = "Band Tails, Path Integrals, Instantons, Polarons, and
All that",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "82--92",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reviews the explanations recently developed
by the authors and their collaborators of how disorder
leads to exponential band tails and to Urbach tails in
optical absorption. It starts with the simplest
single-potential-well models which, despite their
simplicity, are remarkably successful in accounting for
the experimental facts. It then identifies the
weaknesses, hidden or explicit, in these models and
shows, step by step, how they can be corrected by
increasing the sophistication of the procedures used.
Exact results are finally achieved through use of
field-theoretic techniques, and appropriately
formulated single-potential-well models are shown to
reproduce these quite accurately. It is also shown that
the probability distribution of the random potential
must be close to Gaussian, with an autocorrelation
function which cuts off fairly rapidly with distance
for there to be a well-defined, broad energy range in
which there are exponential band tails in the density
of states and Urbach tails in the optical absorption.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0130R (Reviews and tutorial papers; resource
letters); A7110 (General theories and computational
techniques); A7125C (Techniques of band-structure
calculation (general theory, applications of group
theory, analytic continuation, etc.)); A7138 (Polarons
and electron-phonon interactions); A7820 (Optical
properties of bulk materials)",
classification = "741; 921",
corpsource = "Exxon Res and Eng. Co., Annandale, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "absorption; Absorption; autocorrelation function; band
tails; band theory models and calculation methods;
density of; disorder effects; exponential band tails;
field-theoretic; instantons; light; optical absorption;
optics; path integrals; polarons; probability
distribution; random potential; reviews; simple
potential-well models; simplest single-potential-well
models; states; techniques; theory; Urbach tails",
subject = "G.m Mathematics of Computing, MISCELLANEOUS \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics",
treatment = "T Theoretical or Mathematical",
}
@Article{Verbruggen:1988:FQT,
author = "A. H. Verbruggen",
title = "Fundamental Questions in the Theory of
Electromigration",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "93--98",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The theory of electromigration is focused on the force
acting on a lattice defect in a metallic sample that
carries an electric current. Much work has been done to
obtain a better understanding of the underlying
physical mechanisms. The force has been calculated
numerically for defects in several metals, and a
qualitative agreement with the experiments has often
been found. There are, however, still discussions about
the relevance of certain contributions to the force.
This paper provides a review of the basic models and of
questions which still exist in the theory of
electromigration. The relevance of these questions is
illustrated by results of experimental work on the
electromigration of H in V, Nb, and Ta.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630Q (Electromigration)",
classification = "531; 921",
corpsource = "Center for Submicron Technol., Delft Univ. of
Technol., Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "basic models; conceptual difficulties; conduction
electrons; current flow inhomogeneities; direct force;
electric field inhomogeneities; electromigration;
electromigration theory; field inhomogeneities; force
acting on lattice defect; fundamental questions; H in;
H in Ta; H in V; hydrogen; impurity; lattice defects;
metals and alloys; Nb; niobium; screening of electric
fields; tantalum; theory of electromigration;
underlying physical mechanisms; vanadium; wind force",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Foden:1988:TTQ,
author = "C. Foden and K. W. H. Stevens",
title = "Tunneling Times and a Quantum Clock",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "99--102",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of measuring tunneling times by means of a
quantum clock is found to lead to difficulties which
are thought to arise because the Hamiltonian of the
coupled system does not separate into particle and
clock parts.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0365B (Foundations, theory of measurement,
miscellaneous theories); A0530 (Quantum statistical
mechanics); A7340G (Tunnelling: general); B2530
(Semiconductor junctions and interfaces)",
classification = "921; 931; 932",
corpsource = "Dept. of Phys., Nottingham Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "clock interference effects; clocks; coupled system;
coupled system Hamiltonian; difficulties; free
particle; Hamiltonian; Hamiltonian of coupled systems;
Measurements; measuring tunneling times; particle;
particle beams; quantum clock; quantum mechanics;
quantum statistical mechanics; quantum theory;
tunneling times; tunnelling",
treatment = "T Theoretical or Mathematical",
}
@Article{Gefen:1988:CVO,
author = "Yuval Gefen",
title = "Coherent Voltage Oscillations in Small Normal Tunnel
Junctions and the Crossover to the Incoherent Regime",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "103--106",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We discuss the possibility of charge oscillations in a
normal tunnel junction, driven by an external current
source ($L_{ex}$), in the coherent limit. In that limit
the dephasing time $t_\phi$ is larger than the period
$t_p \equiv e / l_{e_x}$. This behavior is modified
when $t_\phi$ decreases.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340G (Tunnelling: general); B1230B (Oscillators);
B2530 (Semiconductor junctions and interfaces)",
classification = "714; 921",
corpsource = "Dept. of Nucl. Phys., Weizmann Inst. of Sci., Rehovot,
Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "circuit oscillations; coherent limit; coherent voltage
oscillations; crossover; crossover to incoherent;
crossover to the incoherent regime; dephasing time;
external current source; incoherent limit; incoherent
regime; Junctions; mesoscopic systems; model current
source; normal tunnel junctions; possibility of charge
oscillations; regime; semiconductor devices; small;
small normal tunnel junctions; submicron junctions;
tunnelling",
treatment = "T Theoretical or Mathematical",
}
@Article{vanKampen:1988:RSN,
author = "N. G. {van Kampen}",
title = "Relative Stability in Nonuniform Temperature",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "107--111",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Landauer has suggested that the relative stability of
a particle diffusing in a bistable potential is
affected by an intervening hot layer. We derive this
effect both from thermodynamics and from the diffusion
equation. For this purpose the proper form of the
diffusion equation in a nonuniform medium is
established for the case of a Brownian particle. If the
diffusion takes place in a ring, the hot layer creates
a steady current.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0540 (Fluctuation phenomena, random processes, and
Brownian motion); A0560 (Transport processes: theory);
A0570 (Thermodynamics)",
classification = "641; 921; 931; 932",
corpsource = "Inst. for Theor. Phys., Utrecht Univ., Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "bistable potential diffusion; Brownian motion;
Brownian particle; diffusion; diffusion equation;
diffusion equation solution; equation derivation;
intervening hot; Landauer effect; layer; Mathematical
Models; mathematical techniques --- Applications;
medium; nonuniform; nonuniform temperature; particle
beams; particle diffusing in bistable potential;
relative stability; ring; steady current;
thermodynamics",
treatment = "T Theoretical or Mathematical",
}
@Article{Risken:1988:BTE,
author = "H. Risken and K. Vogel and H. D. Vollmer",
title = "Boundary-Layer Theory for the Extremely Underdamped
{Brownian} Motion in a Metastable Potential",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "112--118",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A theory for the boundary layer near the critical
trajectory for the extremely underdamped Brownian
motion in a metastable potential is presented. The
probability distribution function in phase space near
this critical trajectory, the average escape energy,
and the correction terms for the zero-friction-limit
escape rate are calculated.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0250 (Probability theory, stochastic processes, and
statistics); A0540 (Fluctuation phenomena, random
processes, and Brownian motion)",
classification = "921; 931; 932",
corpsource = "Theor. Phys. Inst., Ulm Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "average escape energy; boundary layer theory;
boundary-layer solution; boundary-layer theory;
Brownian motion; correction terms; critical trajectory;
distribution function; Mathematical Models;
mathematical techniques --- Eigenvalues and
Eigenfunctions; mean average energy; metastable
potential; particle beams; phase space; probability;
underdamped Brownian motion; zero-friction-limit escape
rate",
treatment = "T Theoretical or Mathematical",
}
@Article{Hanggi:1988:BAC,
author = "Peter Hanggi and Peter Jung",
title = "Bistability in Active Circuits: Application of a Novel
{Fokker--Planck} Approach",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "119--126",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The problem of metastability in electronic circuits
with negative differential resistance, originally
pioneered by Landauer in 1962, is reconsidered from the
viewpoint of a Fokker--Planck modeling for nonlinear
shot noise (master equation). A novel Fokker--Planck
approximation scheme is presented that describes
correctly the deterministic flow and the long-time
dynamics of the master equation. It is demonstrated
that the conventional scheme of a truncated
Kramers-Moyal expansion at the second order
overestimates the transition rates in leading
exponential order. In order to obtain the correct
relative stability, the novel scheme uses a diffusion
coefficient which incorporates information about global
nonlinear fluctuations characterized by the whole set
of all higher-order Kramers-Moyal transport
coefficients.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0230 (Function theory, analysis); A0540 (Fluctuation
phenomena, random processes, and Brownian motion);
A0560 (Transport processes: theory); B1265B (Logic
circuits); B1270E (Active filters and other active
networks); B2560H (Junction and barrier diodes)",
classification = "713; 714; 921",
corpsource = "Augsburg Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "active circuits bistability; active networks;
approach; approximation scheme; bistability in active
circuits; characterized; correct relative stability;
deterministic flow; differential resistance; diffusion;
diffusion coefficient; dynamics; electronic circuits;
flip-flops; fluctuations; Fokker-; Fokker--Planck;
Fokker--Planck approach; Fokker--Planck modeling; for
nonlinear shot noise; global nonlinear fluctuations;
Landauer; long-time; master equation; Mathematical
Models; mathematical techniques --- Applications;
metastability in electronic circuits; negative;
nonlinear shot noise; novel Fokker--Planck; Planck
equation; processes; random noise; semiconductor
diodes, tunnel --- Mathematical Models; set of all
higher-order Kramers-Moyal; transition rates;
transport; transport coefficients; tunnel diode
current-voltage characteristics; tunnel diode with
noise; tunnel diodes",
treatment = "T Theoretical or Mathematical",
}
@Article{Gardiner:1988:QNQ,
author = "C. W. Gardiner",
title = "Quantum Noise and Quantum {Langevin} Equations",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "127--136",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The quantum Langevin equation of Ford, Kac, and Mazur
is rederived and shown to be equivalent to an adjoint
equation. This latter can be handled by means of van
Kampen's cumulant expansion to yield derivations of the
quasiclassical Langevin equation, stochastic
electrodynamics, quantum optical, and quantum Brownian
motion master equations (under appropriate conditions).
The result of Benguria and Kac --- that the quantum
Langevin equation yields the Boltzmann distribution
over energy levels in thermodynamic equilibrium --- is
also verified.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0230 (Function theory, analysis); A0250 (Probability
theory, stochastic processes, and statistics); A0530
(Quantum statistical mechanics); A0540 (Fluctuation
phenomena, random processes, and Brownian motion);
A0560 (Transport processes: theory); A0570
(Thermodynamics)",
classification = "921; 931",
corpsource = "Dept. of Phys., Waikato Univ., Hamilton, New Zealand",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "adjoint equation; Boltzmann distribution; Boltzmann
equation; derivations; electrodynamics; equation
derivation commutation relations preservation; master
equation; Mathematical Models; mathematical techniques
--- Applications; noise; quantum; quantum Brownian
motion master equations; quantum Langevin equations;
quantum noise; quantum optical case; quantum theory;
quasiclassical Langevin equation; statistical
mechanics; stochastic; stochastic processes; theory;
thermodynamic equilibrium; thermodynamics; van Kampen
cumulant expansion; Wigner function",
treatment = "T Theoretical or Mathematical",
}
@Article{Pendry:1988:STD,
author = "John Pendry",
title = "Symmetry and Transport in Disordered Systems",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "137--143",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The transfer matrix for a disordered system enables
averages of integer powers of the resistance to be
found, R**N; application of the symmetric group
generalizes this formula to fractional and negative N,
providing a powerful tool for the study of transport.
Consequences for fluctuations in resistance, 1/f noise,
and frequency response are discussed, as well as a new
sort of state, of fractal dimension 1/2, which is
responsible for transport in localized systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0210 (Algebra, set theory, and graph theory); A0250
(Probability theory, stochastic processes, and
statistics); A0540 (Fluctuation phenomena, random
processes, and Brownian motion); A0560 (Transport
processes: theory); A7290 (Other topics in electronic
transport in condensed matter)",
classification = "531; 701; 921; 933",
corpsource = "Blackett Lab., Imperial Coll., London, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1/2; 1/f noise; direct products; disordered systems;
electric conductivity; fluctuations; fluctuations in;
fractal dimension; fractals; frequency response;
materials; matrix algebra; metallic conductors; noise;
Order-Disorder; probability; probability distributions;
random; resistance; symmetric group; symmetry and
transport; transfer matrix; transfer matrix
generalization; transport in disordered systems;
transport in localized systems; transport processes",
treatment = "T Theoretical or Mathematical",
}
@Article{Likharev:1988:CDT,
author = "K. K. Likharev",
title = "Correlated Discrete Transfer of Single Electrons in
Ultrasmall Tunnel Junctions",
journal = j-IBM-JRD,
volume = "32",
number = "1",
pages = "144--158",
month = jan,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recent theoretical and experimental studies have
revealed a new family of effects taking place in very
small tunnel junctions at low temperatures. The effects
have a common origin, the correlated discrete tunneling
of single electrons and\slash or Cooper pairs resulting
from their electrostatic ('Coulomb') interaction. This
paper presents a brief review of the single-electron
part of the family, including discussion of the
background physics, methods of theoretical description
of the new effects, experimental results, and possible
applications of the new effects in analog and digital
electronics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340G (Tunnelling: general); B2530 (Semiconductor
junctions and interfaces)",
classification = "701; 714; 931; 932",
corpsource = "Dept. of Phys., Moscow State Univ., USSR",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "'set' oscillations; analogue electronics;
applications; background physics; correlated discrete
transfer; correlated discrete tunneling; Coulomb
interaction; description; digital; electronics;
electrons; electrostatic; experimental results;
experimental studies; interaction; junctions;
Junctions; low temperatures; multijunction structures;
of single electrons; semiconductor devices; single
electron; single electrons; sub-electron charge
control; submicron junctions; theoretical; theoretical
studies; tunnelling; ultrasmall tunnel; ultrasmall
tunnel junctions; very small tunnel",
treatment = "A Application; T Theoretical or Mathematical; X
Experimental",
}
@Article{Bouma:1988:FGF,
author = "Gosse Bouma and Esther Koenig and Hans Uszkoreit",
title = "Flexible Graph-Unification Formalism and its
Application to Natural-Language Processing",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "170--184",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A graph-unification-based representation language is
described that was developed as the grammar formalism
for the LILOG research project at IBM Germany. The
Stuttgart Unification Formalism (STUF) differs from its
predecessors in its higher flexibility and its
algebraic structure. It is suited for the
implementation of rather different linguistic
approaches, but is currently employed mainly in the
development of Categorial Unification Grammars with a
lexicalized compositional semantics. Examples from the
syntactic and semantic processing of natural language
are used to illustrate the virtues of the formalism and
of our lexicalist approach to linguistic analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4210 (Formal logic); C4290 (Other computer theory);
C6180N (Natural language processing)",
classification = "721; 723",
corpsource = "Stuttgart Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automata theory; Categorial Unification
Grammars; categorical unification grammars;
computational linguistics; computer graphics; computer
programming languages; flexible graph-unification
formalism; formal languages; grammar formalism;
Grammars; grammars; graph-unification formalism;
languages; lexicalist approach; lexicalized
compositional; LILOG; linguistic; natural language;
natural languages; natural-language processing;
research project; semantic processing; semantics;
Stuttgart Unification Formalism; syntactic processing;
theory",
subject = "I.1.1 Computing Methodologies, ALGEBRAIC MANIPULATION,
Expressions and Their Representation, Representations
(General and Polynomial) \\ I.1.3 Computing
Methodologies, ALGEBRAIC MANIPULATION, Languages and
Systems, Nonprocedural languages \\ G.2.m Mathematics
of Computing, DISCRETE MATHEMATICS, Miscellaneous \\
I.2.7 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
Natural Language Processing",
treatment = "A Application; T Theoretical or Mathematical",
}
@Article{Black:1988:ECD,
author = "Ezra Black",
title = "Experiment in Computational Discrimination of
{English} Word Senses",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "185--194 (or 185--193??)",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A number of researchers in text processing have
independently observed that people can consistently
determine in which of several given senses a word is
being used in text, simply by examining the half dozen
or so words just before and just after the word in
focus. The question arises whether the same task can be
accomplished by mechanical means. Experimental results
are presented which suggest an affirmative answer to
this query. Three separate methods of discriminating
English word senses are compared
information-theoretically. Findings include a strong
indication of the power of domain-specific content
analysis of text, as opposed to domain-general
approaches.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6130 (Speech analysis and processing techniques);
C1250C (Speech recognition)",
classification = "721; 723",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automata theory; computational discrimination;
Computational Linguistics; computer metatheory; content
analysis; data processing; domain-general approaches;
domain-specific; domain-specific content analysis;
English word senses; experimentation; human factors;
information-theoretically; languages; measurement;
performance; processing; speech analysis and
processing; speech recognition; text; text processing",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing \\ H.1.2
Information Systems, MODELS AND PRINCIPLES,
User/Machine Systems, Human information processing \\
I.7.0 Computing Methodologies, TEXT PROCESSING, General
\\ J.5 Computer Applications, ARTS AND HUMANITIES,
Linguistics",
treatment = "X Experimental",
}
@Article{Frisch:1988:SAC,
author = "Rudolf Frisch and Antonio Zamora",
title = "Spelling Assistance for Compound Words",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "195--200",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a method for providing spelling
assistance for Germanic compound words. The technique
analyzes an unknown word to determine its components,
using a dictionary which associates word components
with codes that describe their compounding
characteristics. Language-specific morphological
transformations are used to take into consideration
common intraword elision patterns. Special dictionary
entries, heuristic rules, and lexical distance measures
are used to provide the best possible replacement
compound words. The method is fast and provides
spelling assistance and hyphenation support in an
interactive environment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7106 (Word processing)",
classification = "721; 723",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; automata theory; compound words;
compounding characteristics; data processing;
dictionary; documentation; Germanic; heuristic;
hyphenation support; interactive environment; intraword
elision patterns; languages; lexical distance measures;
morphological; morphological transformations; rules;
software packages; spelling assistance;
transformations; unknown word; verification; Word
Processing; word processing",
subject = "I.7.1 Computing Methodologies, TEXT PROCESSING, Text
Editing, Spelling",
treatment = "P Practical",
}
@Article{Takeda:1988:CES,
author = "Koichi Takeda and Emiko Suzuki and Tetsuro Nishino and
Tetsunosuke Fujisaki",
title = "{CRITAC} --- an Experimental System for {Japanese}
Text Proofreading",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "201--216",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes an experimental expert system for
proofreading Japanese text. The system is called CRITAC
(CRITiquing using Accumulated knowledge). It can detect
typographical errors, Kana-to-Kanji conversion errors,
and stylistic errors in Japanese text. We describe the
basic concepts and features of CRITAC, including
preprocessing of text, a high-level text model,
Prolog-coded heuristic proofreading knowledge, and a
user-friendly interface. Although CRITAC has been
primarily designed for Japanese text, it appears that
most of the concepts and the architecture of CRITAC can
be applied to other languages as well.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7106 (Word processing)",
classification = "721; 723",
corpsource = "Carnegie Mellon Univ., Pittsburgh, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "artificial intelligence --- Expert Systems; automata
theory; CRITAC; data processing; documentation; errors;
experimental expert system; experimentation; expert
systems; friendly interface; high-level text; Japanese
text; Kana-to-Kanji conversion; kana-to-kanji
conversion errors; languages; model; performance;
preprocessing; Prolog-coded heuristic proofreading
knowledge; proofreading; stylistic errors; text
editing; typographical errors; user-; Word Processing",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Text
analysis \\ I.7.1 Computing Methodologies, TEXT
PROCESSING, Text Editing",
treatment = "P Practical",
}
@Article{DOrta:1988:LSR,
author = "Paolo D'Orta and Marco Ferretti and Alex Martelli and
Sergio Melecrinis and Stefano Scarci and Giampiero
Volpi",
title = "Large-Vocabulary Speech Recognition: a System for the
{Italian} Language",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "217--226",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We describe a research project in automatic speech
recognition which has led to the development of an
experimental large-vocabulary real-time recognizer for
Italian, and show how the maximum-likelihood techniques
which had been employed in the development of prototype
recognizers for English can be tailored to a language
with substantially different characteristics.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6130 (Speech analysis and processing techniques);
C1250C (Speech recognition)",
classification = "723; 751; 752; 922",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "automatic speech recognition; experimentation; Italian
language; languages; large-; large-vocabulary;
maximum-likelihood; measurement; pattern recognition
systems; performance; probability; real-time
recognizer; Recognition; speech; speech recognition;
techniques; theory; verification; vocabulary real-time
recognizer",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Speech
recognition and understanding \\ J.5 Computer
Applications, ARTS AND HUMANITIES, Linguistics \\ F.1.2
Theory of Computation, COMPUTATION BY ABSTRACT DEVICES,
Modes of Computation, Probabilistic computation",
treatment = "P Practical",
}
@Article{Merialdo:1988:MDV,
author = "Bernard Merialdo",
title = "Multilevel Decoding for Very-Large-Size-Dictionary
Speech Recognition",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "227--237",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An important concern in the field of speech
recognition is the size of the vocabulary that a
recognition system is able to support. Large
vocabularies introduce difficulties involving the
amount of computation the system must perform and the
number of ambiguities it must resolve. But, for
practical applications in general and for dictation
tasks in particular, large vocabularies are required.
This paper describes a new organization of the
recognition process, Multilevel Decoding (MLD), that
allows the system to support a Very-Large-Size
Dictionary (VLSD) --- one comprising over 100 000
words. With MLD, the effect of dictionary size on the
accuracy of recognition can be studied. Recognition
experiments using 10 000- and 200 000-word dictionaries
are compared. They indicate that recognition using a
200 000-word dictionary is more accurate than
recognition using a 10 000-word dictionary.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6130 (Speech analysis and processing techniques);
C1250C (Speech recognition)",
classification = "723; 751",
corpsource = "IBM, Paris, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "200 000-word dictionary; algorithms; ambiguities;
codes, symbolic --- Decoding; computation; decoding;
Decoding; dictation tasks; dictionary size; languages;
large vocabularies; measurement; Multilevel; multilevel
decoding; performance; Recognition; speech; speech
recognition; very-large-size-dictionary;
very-large-size-dictionary speech recognition;
vocabulary",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Speech
recognition and understanding",
treatment = "P Practical",
}
@Article{Maruyama:1988:JSA,
author = "N. Maruyama and M. Morohashi and S. Umeda and E.
Sumita",
title = "A {Japanese} sentence analyzer",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "238--250",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper presents the design of a broad-coverage
Japanese sentence analyzer which can be part of various
Japanese processing systems. The sentence analyzer
comprises two components: the lexical analyzer and the
syntactic analyzer. Lexical analysis, i.e., segmenting
a sentence into words, is a formidable problem for a
language like Japanese, because it has no explicit
delimiters (blanks) between written words. In practical
applications, this task is made more difficult by the
occurrence of words not listed in a dictionary. We have
developed a five-layered knowledge source and used it
successfully in the lexical analyzer, resulting in
accurate segmentation, even in cases where there are
unknown words. The syntactic analyzer has two modules:
One consists of an augmented context-free grammar and
the PLNLP parser; the other is the dependency structure
constructor, which converts the phrase structures to
dependency structures. The dependency structures
represent various key linguistic relations in a more
direct way. The dependency structures have semantically
important information such as tense, aspect, and
modality, as well as preference scores reflecting
relative ranking of parse acceptability.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7820 (Humanities)",
classification = "721; 723",
corpsource = "Tokyo Woman's Christian Univ., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aspect; automata theory; board-coverage; Computational
Linguistics; computer metatheory; context-free grammar;
delimiters; dependency structure constructor; five-;
information retrieval; Japanese processing systems;
Japanese sentence analyzer; key; languages; layered
knowledge source; lexical analyzer; linguistic
relations; linguistics; modality; modules; parse
acceptability; pattern recognition systems; PLNLP
parser; preference; scores; sentence analyzer;
syntactic analyzer; tense",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Text
analysis \\ I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Language
parsing and understanding",
treatment = "A Application; P Practical",
}
@Article{Velardi:1988:CGA,
author = "Paola Velardi and Maria Teresa Pazienza and Mario
De'Giovanetti",
title = "Conceptual graphs for the analysis and generation of
sentences",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "251--267",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A system for analyzing and generating Italian texts is
under development. Semantic knowledge on word-sense
patterns is used to relate the linguistic structure of
a sentence to a conceptual representation (a conceptual
graph). Conceptual graphs are stored in a database and
accessed by a natural-language query\slash answering
module. The system analyzes a text supplied by a
press-agency-release database. It consists of three
modules: a morphological, a syntactic, and a semantic
processor. The semantic analyzer uses a conceptual
lexicon of word-sense descriptions, currently including
about 850 entries. A description is an extended case
frame providing the surface semantic patterns (SSP) of
a word-sense w. SSPs express both semantic constraints
and word-usage information, such as commonly found word
patterns, idioms, and metaphoric expressions. SSPs are
used by the semantic interpreter to build a conceptual
graph of the sentence, which is then accessed by the
query-answering and language-generation modules. This
paper claims that the SSP approach is viable and
necessary to cope with language phenomena in
unrestricted domains. Surface patterns are easily
acquired inductively from the natural-language corpus
rather than deductively from predefined conceptual
structures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory); C6180N (Natural
language processing); C7820 (Humanities)",
classification = "721; 723",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "analysis; automata theory; case frame; computational
linguistics; Computational Linguistics; computer
graphics; computer metatheory; conceptual graph;
conceptual graphs; conceptual lexicon; conceptual
representation; database; expressions; extended;
generation; graph theory; idioms; Italian texts;
knowledge; language phenomena; language query/answering
module; languages; linguistic structure; metaphoric;
natural languages; natural-; pattern recognition
systems; press-agency-release; query languages;
query-answering; semantic; semantic constraints;
semantic knowledge; semantic processor; sentences;
surface semantic patterns; theory; word patterns;
word-sense patterns; word-usage information",
subject = "I.2.7 Computing Methodologies, ARTIFICIAL
INTELLIGENCE, Natural Language Processing, Language
generation",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Pignal:1988:AHS,
author = "P. I. Pignal",
title = "An analysis of hardware and software availability
exemplified on the {IBM} 3725 communication
controller",
journal = j-IBM-JRD,
volume = "32",
number = "2",
pages = "268--278",
month = mar,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Because of the growing commercial, governmental, and
scientific requirements for system availability,
evaluating this factor has become important. This paper
presents a unified approach to hardware and software
availability of a system in the operational phase. The
aim is to evaluate the availability in a given time
interval, to show how to improve it, and to determine
the probability that a specified level is met over the
period. The inputs are the failure and repair rates of
the system elements, and the functional relationship
between them. Field tracking provides the failure and
repair data, and Markov-chain techniques make it
possible to construct, reduce, and solve the model.
Availability is computed by the program package System
Availability Estimator (SAVE). The model has been used
and validated with actual field data for the IBM 3725
Communication Controller.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140Z (Other and miscellaneous); C5470 (Performance
evaluation and testing)",
classification = "722; 723; 731; 732; 913; 922",
corpsource = "IBM Commun. Products Div., La Gaude, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "communication controller; computer software ---
Reliability; computer systems, digital; control
equipment, electric; design; field tracking; functional
relationship; hardware and software availability;
hardware availability; IBM 3725; IBM computers;
Markov-chain; measurement; operational phase;
performance; probability; program package; reliability;
Reliability; repair rates; software availability;
System Availability Estimator; techniques; time
interval; verification",
subject = "C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ B.4.2 Hardware, INPUT/OUTPUT AND DATA
COMMUNICATIONS, Input/Output Devices, Channels and
controllers",
treatment = "T Theoretical or Mathematical",
}
@Article{Landauer:1988:SVC,
author = "R. Landauer",
title = "Spatial Variation of Currents and Fields Due to
Localized Scatterers in Metallic Conduction",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "306--316",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Volume 1 of this journal included a paper with the
above title. Studies of small samples, in recent years,
as well as earlier work on disordered samples, have
caused some of the content of the earlier work to
become widely understood. The aspects stressed in the
title, however, relating to the spatial variations in
the vicinity of a localized scattering center, have
received little attention, except in electromigration
theory debates. We return to these aspects of the
earlier paper, and emphasize that the transport field
associated with a point-defect scattering center is a
highly localized dipole field. The nonlinearity of
resistance in terms of scattering cross section is
discussed. A theory of these effects, which does
justice to the coherent multiple-scattering effects
present at low temperatures, does not yet exist. Such a
theory is likely to modify the effects, but it is
unlikely to cause them to disappear. We also discuss
closed loops, without leads; the persistent currents
expected in these; and a possible method of detecting
the persistent currents.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7210F (Scattering by point defects, dislocations,
surfaces, and other imperfections); A7215Q (Scattering
mechanisms and Kondo effect)",
classification = "531; 701; 704; 711",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "closed loops; coherent multiple-; design; disordered
samples; Electric Conductivity; electric conductors;
electrical conductivity of solids; electromagnetic
waves --- Scattering; electromagnetism; localized
dipole field; localized scatterers; localized
scattering center; low temperatures; measurement;
metallic conduction; metals and alloys; nonlinearity
of; persistent currents; point-defect; point-defect
scattering center; resistance; scattering center;
scattering cross section; scattering effects; spatial;
spatial variation; theory; variations",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles \\ J.2 Computer Applications, PHYSICAL SCIENCES
AND ENGINEERING, Electronics",
treatment = "T Theoretical or Mathematical",
}
@Article{Buttiker:1988:SEC,
author = "M. Buttiker",
title = "Symmetry of Electrical Conduction",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "317--334",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The resistance of a conductor measures in a four-probe
setup is invariant if the exchange of the voltage and
current sources is accompanied by a magnetic field
reversal. We present a derivation of this theorem. The
reciprocity of the resistances is linked directly to
the microscopic reciprocity of the S-matrix, which
describes reflection at the sample and transmission
through the sample. We demonstrate that this symmetry
holds for a conductor with an arbitrary number of
leads. Since leads act like inelastic scatterers,
consideration of a many-probe conductor also implies
that the reciprocity of resistances is valid in the
presence of inelastic scattering. Various conductance
formulas are discussed in the light of the reciprocity
theorem. We discuss some implications of our results
for the nature of a voltage measurement and point to
the difference between chemical potentials and the
local electric potential.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7210B (General formulation of transport theory)",
classification = "701; 704; 942",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "arbitrary number of; chemical potentials; conductance
formulae; conduction; conduction symmetry;
Conductivity; current voltage interchange; current
voltage reciprocity; design; electric conductivity ---
Theory; electric conductors --- Electric Properties;
electric field effects; electric measurements;
electrical; electrical conductivity of solids;
electronic; four point probe; four-probe setup;
inelastic scattering; leads; local electric potential;
magnetic field reversal; many-probe conductor;
measurement; microscopic reciprocity; reciprocity
theorem; S-matrix; theory; voltage",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles \\ G.1.m Mathematics
of Computing, NUMERICAL ANALYSIS, Miscellaneous",
treatment = "B Bibliography; T Theoretical or Mathematical",
}
@Article{Washburn:1988:FEC,
author = "S. Washburn",
title = "Fluctuations in the Extrinsic Conductivity of
Disordered Metal",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "335--346",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Random fluctuations of the electrical conductance are
ubiquitous in small (typical dimension L APP 1STH 1
$\mu$ m) metallic samples at low temperatures
(typically T APP 1STH 1 K approximately equals 0.09
meV). The fluctuations result from the
quantum-mechanical interference of the carrier
wavefunctions. The superpositions of the wavefunctions
depend randomly on the placement of impurities, on
magnetic field, and on the current driven through the
sample. At length scale $L_\phi$ (the average distance
over which the carriers retain phase information), the
fluctuations always have amplitude DELTA G@APEQ@e**2/h,
and any observations at scale larger than the coherence
length yield a decreased amplitude of the fluctuations.
Since the carrier wavefunctions are not classical,
local objects (they extend over regions of size
$L_\phi$), the conductance contains nonlocal terms. For
instance, the conductance is not zero far from the
classical current paths through the sample and is not
symmetric under the reversal of the magnetic field. The
physics of the fluctuations is reviewed, and some of
the experiments which illuminate the physics are
described.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7200 (Electronic transport in condensed matter)",
classification = "531; 701; 711; 942",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1 K; 1 micron; carrier wavefunctions; coherence;
conductance; conductance fluctuations; current driven;
design; disordered metal; Electric Conductivity;
electric field effects; electrical conductance;
electrical conductivity of solids; electromagnetic
waves; experiments; extrinsic conductivity; extrinsic
conductivity of disordered metal; fluctuations;
impurities; interference; length; localized samples;
low temperatures; magnetic field; measurement; metals
and alloys; performance; placement of;
quantum-mechanical; random fluctuations; small metallic
samples; theory",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "B Bibliography; T Theoretical or Mathematical; X
Experimental",
}
@Article{Kaplan:1988:MCP,
author = "S. B. Kaplan and Allan M. Hartstein",
title = "Mesoscopic Coherence Phenomena in Semiconductor
Devices",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "347--358",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Semiconductor devices have several attractive
properties which make them useful in the study of
electronic coherence phenomena such as universal
conductance fluctuations. The use of gated devices
allows the Fermi level, and thus the electronic
wavelength, to be adjusted in order to study energy
correlation effects. The two-dimensional electron gas
formed beneath the gate can be tilted with respect to
the magnetic field to reveal that the field correlation
length of the fluctuations obeys a cosine law. This
suggests that the fluctuations are caused by quantum
interference in the same way that the Aharonov--Bohm
effect arises in metallic rings. The energy range over
which electrons are correlated in these materials is
generally larger than in metals. This allows one to
study these conductance fluctuations at much higher
temperatures than are feasible in metallic conductors.
For the same reason, larger source-drain voltages can
be applied to observe asymmetry and nonlinear effects
in the conductance.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7220D (General theory, scattering mechanisms); B2520
(Semiconductor theory, materials and properties); B2560
(Semiconductor devices)",
classification = "531; 701; 714; 931; 933",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Aharonov--Bohm effect; design; electrical conductivity
of crystalline semiconductors and; electron gas;
electronic; electronic coherence phenomena; Electronic
Properties; energy correlation effects; Fermi level;
field correlation length; field effect transistors;
fluctuations; gated devices; insulators; magnetic
field; measurement; mesoscopic coherence; mesoscopic
coherence phenomena; metallic rings; metals and alloys
--- Electronic Properties; nonlinear effects;
performance; quantum interference; quantum theory;
semiconductor devices; source-drain voltages; theory;
two-dimensional; universal conductance; universal
conductance fluctuations; wavelength",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
treatment = "B Bibliography; T Theoretical or Mathematical; X
Experimental",
}
@Article{Cheung:1988:IRM,
author = "Ho-Fai Cheung and Yuval Gefen and Eberhard K. Riedel",
title = "Isolated Rings of Mesoscopic Dimensions. Quantum
Coherence and Persistent Currents",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "359--371",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Persistent currents in small nonsuperconducting rings
threaded by a magnetic flux are a manifestation of
novel quantum effects in submicron systems. We present
theoretical results for one-channel and multichannel
systems concerning the dependence of the current
amplitude on the number of channels and geometry,
temperature, and degree of disorder. Inelastic
scattering is considered for one-channel loops only. We
also discuss the observability of the effect.",
acknowledgement = ack-nhfb,
affiliation = "Univ of Washington, Seattle, WA, USA",
affiliationaddress = "Univ of Washington, Seattle, WA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7210B (General formulation of transport theory)",
classification = "701; 711; 714; 931; 942",
corpsource = "Dept. of Phys., Washington Univ., Seattle, WA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Aharonov Bohm effect; channels; coherence; degree of
disorder; design; effects; electrical conductivity of
solids; electromagnetic waves --- Scattering;
electromagnetism; geometry; inelastic scattering;
isolated rings; magnetic field effects; magnetic flux;
magnetic flux threaded rings; magnetoresistance;
measurement; mesoscopic dimensions; nonsuperconducting
rings; number of; observability; performance;
persistent currents; quantum; quantum coherence;
quantum theory; small nonsuperconducting rings;
submicron systems; temperature; theoretical results;
theory",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies \\ G.m Mathematics of Computing,
MISCELLANEOUS",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Fowler:1988:ETS,
author = "A. B. Fowler and J. J. Wainer and R. A. Webb",
title = "Electronic Transport in Small Strongly Localized
Structures",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "372--383",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We review some recent results on the low-temperature
transport properties (T less than 4 K) of very small
silicon metal-oxide field-effect transistors in the
insulating regime of conduction. Our devices are
lithographically patterned to have widths as small as
0.05 $\mu$ m and lengths as short as 0.06 $\mu$ m.
These small transistors exhibit new and unexpected
sample-specific fluctuation behavior in the gate
voltage, temperature, and magnetic field dependence of
the conductance. We discuss both resonant tunneling and
Mott variable-range hopping, the two main transport
mechanisms in these devices at low temperature.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2520C (Elemental semiconductors); B2530F
(Metal-insulator-semiconductor structures); B2560R
(Insulated gate field effect transistors)",
classification = "549; 712; 714; 933",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0; 50 to 60 nm; design; electronic transport;
elemental semiconductors; field dependence of
conductance; field effect transistors; fluctuation
behavior; gate voltage; hopping conduction; insulated
gate; insulating; localized structures; low-temperature
transport; magnetic; measurement; metal-oxide
field-effect transistors; MOSFETs; Mott; Mott
variable-range hopping; performance; properties; regime
of conduction; resonant tunneling; sample-specific;
semiconducting silicon; semiconductor devices, MOSFET;
semiconductors; Si; silicon; silicon metal-oxide
field-effect transistors; small transistors;
temperature; theory; to 4 K; transistors, field effect;
transport mechanisms; Transport Properties; tunnelling;
variable-range hopping",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies",
treatment = "X Experimental",
}
@Article{Stone:1988:WMW,
author = "S. Douglas Stone and Aaron Szafer",
title = "What is Measured When You Measure a Resistance? ---
the {Landauer} Formula Revisited",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "384--413",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We re-examine the question of what constitutes the
physically relevant quantum-mechanical expression for
the resistance of a disordered conductor in light of
recent experimental and theoretical advances in our
understanding of the conducting properties of
mesoscopic systems. It is shown that in the absence of
a magnetic field, the formula proposed by Buttiker,
which expresses the current response of a multi-port
conductor in terms of transmission matrices, is
derivable straightforwardly from linear response
theory. We also present a general formalism for solving
these equations for the resistance given the scattering
matrix. This Landauer-type formula reduces to g equals
(e**2/h)Tr(tt** DAGGER), where g is the conductance and
t is the transmission matrix, for the two-probe case.
It is suggested that this formula provides the best
description of the present class of experiments
performed in two-probe or multi-probe measuring
configurations, and that the subtleties leading to
various different Landauer formulas are not relevant to
these experiments.",
acknowledgement = ack-nhfb,
affiliation = "Yale Univ, New Haven, CT, USA",
affiliationaddress = "Yale Univ, New Haven, CT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0365 (Quantum theory; quantum mechanics); A1220D
(Specific calculations and limits of quantum
electrodynamics); A7210B (General formulation of
transport theory)",
classification = "701; 704; 931; 942",
corpsource = "Dept. of Appl. Phys., Yale Univ., New Haven, CT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "conducting; design; disordered conductor; electric
conductors --- Theory; electric measurements; electric
resistance; electrical conductivity of solids;
electromagnetism; experimentation; general formalism;
Landauer formula; Landauer-type formula; measurement;
measuring configurations; mechanical expression;
multi-port conductor; multi-probe; multi-probe
conductors; performance; properties of mesoscopic
systems; quantum electrodynamics; quantum theory;
quantum-; quantum-mechanical expression; Resistance;
scattering matrix; theory; two probe measuring
configuration",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Electronics \\ J.2 Computer Applications,
PHYSICAL SCIENCES AND ENGINEERING, Physics \\ G.m
Mathematics of Computing, MISCELLANEOUS",
treatment = "B Bibliography; T Theoretical or Mathematical",
xxauthor = "A. D. Stone and A. Szafer",
}
@Article{Kirtley:1988:STM,
author = "J. R. Kirtley and S. Washburn and M. J. Brady",
title = "Scanning Tunneling Measurements of Potential Steps at
Grain Boundaries in the Presence of Current Flow",
journal = j-IBM-JRD,
volume = "32",
number = "3",
pages = "414--418",
month = may,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We have used a new technique to simultaneously measure
the surface topography and surface potential of
current-carrying polycrystalline Au$_{60}$Pd$_{40}$
thin films using a scanning tunneling microscope. We
find abrupt steps in the surface potential due to
scattering from grain boundaries in these films.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6116D (Electron microscopy determinations); A7215E
(Electrical and thermal conduction in crystalline
metals and alloys)",
classification = "539; 547; 701; 741; 933; 942",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "abrupt; Au/sub 60/Pd/sub 40/ thin films; crystals ---
Electric Properties; current carrying film; current
flow; design; electric measurements; electrical
conductivity of crystalline metals and alloys;
experimentation; films --- Microscopic Examination;
gold alloys; gold palladium alloys; grain boundaries;
measurement; microscopy; palladium alloys; performance;
polycrystalline; potential steps; scanning tunneling
measurements; scanning tunneling microscope; scanning
tunnelling; scattering from grain boundaries;
simultaneously measure; steps; surface potential;
surface topography; theory; Thin Films",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Physics",
treatment = "X Experimental",
}
@Article{Hatzakis:1988:MPM,
author = "Michael Hatzakis",
title = "Materials and Processes for Microstructure
Fabrication",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "441--453",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The fabrication of structures considerably smaller
than the devices and circuits that are mass-produced
for use in computers and other electronic equipment is
the subject of this paper. Devices of <1$\mu$m
(microstructures) and <100 nm (nanostructures) minimum
dimensions were made possible in a practical sense only
after the introduction of electron beams and the
associated processes, as lithographic tools in the
early 1960s. This paper presents a historical
perspective of this very important chapter in
lithographic technology, primarily from the point of
view of materials and processes. In addition, the
important criteria that have to be considered in the
fabrication of small structures, with respect to the
interaction of the writing beam with the resist
material and the substrate, and the subsequent
pattern-transferring processes, are discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Res. Center",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography)",
classification = "713; 714; 745; B2550G (Lithography)",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "electron beam lithography; Electron beams; electron
beams; historical perspective; iii-v compounds;
integrated circuit manufacture; Lithographic
technology; lithographic technology; lithographic
tools; Lithographic tools; lithography; Materials;
microelectronics; microstructure fabrication;
Microstructure fabrication; Nanostructures;
nanostructures; pattern-transferring processes;
Pattern-transferring processes; pattern-transferring
processes; resist material; Resist material;
semiconductor technology; small structures; writing
beam; Writing beam; writing beam",
thesaurus = "Electron beam lithography; Semiconductor technology",
treatment = "P Practical",
}
@Article{Umbach:1988:NHS,
author = "Corwin P. Umbach and Alec N. Broers and Roger H. Koch
and C. Grant Wilson and Robert B. Laibowitz",
title = "Nanolithography with a high-resolution {STEM}",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "454--461",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A high-resolution scanning transmission electron
microscope (STEM) with a beam diameter approaching 0.6
nm has been adapted for the patterning of complex
fine-line nanostructures. An IBM PC XT is used as the
pattern generator to direct the scan electronics from a
Cambridge Stereoscan 250 which have been interfaced
with the scanning coils of the STEM. A study of the
ultimate resolution of the newly designed
acid-catalyzed resist
poly(p-t-butyloxycarbonyloxystyrene) has been carried
out. The STEM has proven to be a flexible tool in the
fabrication of individual nanostructure devices for
quantum transport studies in mesoscopic devices smaller
than an electron phase-coherence length.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Res. Center",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography)",
classification = "713; 714; 741; 745; 817; B2550G (Lithography)",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Acid-catalyzed resist; acid-catalyzed resist; beam
diameter; Beam diameter; Cambridge; Cambridge
Stereoscan 250; complex fine-line; Complex fine-line
nanostructures; computers, personal; electron beam
lithography; high-resolution stem; high-resolution
STEM; High-resolution STEM; IBM PC XT; integrated
circuit manufacture; integrated circuit technology;
lithography; mesoscopic devices; Mesoscopic devices;
mesoscopic devices; microscope; Microscopic
Examination; nanolithography; nanostructure devices;
Nanostructure devices; nanostructures; Pattern
generator; pattern generator; Patterning; patterning;
photoresists; Poly(p-t-butyloxycarbonyloxystyrene);
poly(p-t-butyloxycarbonyloxystyrene); quantum transport
studies; Quantum transport studies; scanning coils;
Scanning coils; scanning transmission electron;
Scanning transmission electron microscope;
scanning-transmission electron microscopy; Stereoscan
250",
thesaurus = "Electron beam lithography; Integrated circuit
technology; Scanning-transmission electron microscopy",
treatment = "P Practical",
xxauthor = "C. P. Umbach and A. N. Broers and R. H. Koch and C. G.
Willson and R. B. Laibowitz",
}
@Article{Chang:1988:NT,
author = "T. H. P. Chang and Dieter P. Kern and Ernst Kratschmer
and Kim Y. Lee and Hans E. Luhn and Mark A. McCord and
Stephen A. Rishton and Yuli Vladimirsky",
title = "Nanostructure Technology",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "462--493",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The ability to fabricate structures with lateral
dimensions in the sub-100-nm range has opened a new
field of research. This paper first reviews recent
advances in nanolithography techniques, with a brief
discussion of their relative merits and fundamental
limits. Special emphasis is given to the scanning
electron-beam method, which is the most widely used
nanolithography method at the present time. The two
main areas of nanostructure research are device
technology and basic science. Highlights of a number of
exploratory programs in these two areas are
presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Res. Center",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "713; 714; 745; 932; B2550G (Lithography); B2570
(Semiconductor integrated circuits)",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Basic science; basic science; device; Device
technology; electron beam lithography; electron beams;
electron-beam method; integrated circuit manufacture;
integrated circuit technology; lateral dimensions;
Lateral dimensions; lateral dimensions; lithography;
nanolithography; nanolithography techniques;
Nanolithography techniques; nanostructure;
Nanostructure research; nanostructure research;
Performance; scanning; scanning electron-beam method;
Scanning electron-beam method; technology",
thesaurus = "Electron beam lithography; Integrated circuit
technology",
treatment = "P Practical",
}
@Article{Pfeiffer:1988:HHE,
author = "Hans C. Pfeiffer and Timothy R. Groves and Thomas H.
Newman",
title = "High-throughput, high-resolution electron-beam
lithography",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "494--501",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The introduction of the shaped-beam imaging technique
has greatly enhanced the exposure efficiency of
electron-beam lithography systems. IBM's EL systems
provide the throughput needed for lithography
applications in semiconductor fabrication lines. The
resolution of these systems has been steadily improved
over the past 15 years in support of the semiconductor
lithography trend toward submicron dimensions. This
paper describes the latest version (EL-3 system)
capable of fabricating 0.25-$\mu$m features. The
technical challenges of submicron e-beam lithography
are discussed, and practical solutions together with
experimental results are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Gen. Technol. Div.",
affiliationaddress = "Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography)",
classification = "713; 714; 745; 932; B2550G (Lithography)",
corpsource = "IBM, Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.25 Micron; 0.25 micron; EL-3 system; electron beam
lithography; electron beams; electron-beam lithography;
exposure efficiency; Exposure efficiency; exposure
efficiency; high-resolution; high-resolution
electron-beam lithography; High-resolution
electron-beam lithography; high-throughput; imaging
technique; integrated circuit manufacture; lithography;
Performance; Semiconductor fabrication lines;
semiconductor fabrication lines; Semiconductor
lithography; semiconductor lithography; semiconductor
technology; shaped-beam; Shaped-beam imaging technique;
shaped-beam imaging technique; submicron dimensions;
Submicron dimensions; throughput; Throughput",
numericalindex = "Size 2.5E-07 m",
thesaurus = "Electron beam lithography; Semiconductor technology",
treatment = "P Practical; X Experimental",
}
@Article{Broers:1988:RLE,
author = "A. N. Broers",
title = "Resolution Limits for Electron-Beam Lithography",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "502--513",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper discusses resolution limits for
electron-beam fabrication. Electron beams have been
used to produce structures 1 nm in size and devices
with minimum features of about 20 nm. In all cases the
resolution is set primarily by the range of the
electron interaction phenomena that form the
structures, and not by the size of the electron beam
used to write the patterns. The beam can be as small as
0.5 nm. Devices built to date have been fabricated with
conventional resist processes; these have an ultimate
resolution of about 10 nm. Experimental data for PMMA,
the highest-resolution electron resist, show that
resolution is independent of molecular weight and is
therefore not a function of the molecular size. The
most promising of the methods offering resolution below
10 nm is the direct sublimation of materials such as
AlF$_3$ and Al$_2$O$_3$; 1-nm structures have been
fabricated. There is the possibility of making devices
by direct modification of the electrical properties of
conductors, semiconductors, or superconductors by means
of high-energy electron bombardment. In these cases no
intermediate fabrication process would be used, and it
might be possible to reach dimensions comparable to the
beam diameter.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. Eng.",
affiliationaddress = "Cambridge Univ, Cambridge, Engl",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "AlF3/int Al/int F3/int F/int AlF3/bin Al/bin F3/bin
F/bin; Al2O3/int Al2/int Al/int O3/int O/int Al2O3/bin
Al2/bin Al/bin O3/bin O/bin",
classcodes = "B2550G (Lithography)",
classification = "713; 714; 745; 932; B2550G (Lithography)",
corpsource = "Dept. of Electr. Eng., Cambridge Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al$_2$O$_3$; Al$_2$O/sub 3/; AlF$_3$; AlF/sub 3/; beam
diameter; conventional; Conventional resist processes;
direct; direct sublimation; Direct sublimation;
electron beam lithography; electron beams; electron
bombardment; electron interaction; electron interaction
phenomena; Electron interaction phenomena; electron
resists; electron-beam fabrication; Electron-beam
fabrication; electron-beam lithography; features;
integrated circuit manufacture; lithography; minimum;
Minimum features; molecular weight; Molecular weight;
Performance; PMMA; resist processes; resolution limits;
Resolution limits; resolution limits; sublimation",
thesaurus = "Electron beam lithography; Electron resists",
treatment = "P Practical; X Experimental",
}
@Article{Hohn:1988:AEL,
author = "F. J. Hohn and Alan D. Wilson and Philip Coane",
title = "Advanced Electron-Beam Lithography for 0.5-$\mu$m to
0.25-$\mu$m Device Fabrication",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "514--522",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "High-resolution lithographic capability is required
for the fabrication of fully scaled semiconductor
devices at minimum dimensions of 0.5 $\mu$ m to 0.25
$\mu$ m --- the prototype for the semiconductor logic
and memory CMOS devices of the 1990s. Electron-beam
exposure tools provide this capability. Fully scaled
0.5-$\mu$m test devices were fabricated using a
modified EL-3 variable shaped-electron-beam system,
while 0.25-$\mu$m ground-rule lithography was
accomplished with a Gaussian round-electron-beam Vector
Scan system. An important part of this technology is
the selection of lithographic resist system and the
process used for pattern definition and transfer.
Twelve or more lithographic steps are often needed for
circuit devices with the above minimum dimensions. For
fully scaled applications, each pattern level must be
defined by electron-beam lithography, and each level
may require a specific lithographic resist.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Res. Center",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B2550G
(Lithography)",
classification = "713; 714; 745; 932; B2550G (Lithography); B2570D
(CMOS integrated circuits)",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.25 To 0.5 micron; 0.25 to 0.5 micron; CMOS; CMOS
device fabrication; CMOS devices; CMOS integrated
circuits; device fabrication; Device fabrication;
devices; EL-3 variable shaped-electron-beam system;
electron beam lithography; electron beams;
Electron-beam lithography; electron-beam lithography;
fully scaled; Fully scaled semiconductor devices;
Gaussian round-electron-beam Vector Scan; Gaussian
round-electron-beam Vector Scan system; ground-;
Ground-rule lithography; ground-rule lithography;
high-resolution; integrated circuit manufacture;
integrated circuit technology; lithography; memory;
Memory; memory CMOS devices; Pattern definition;
pattern definition; Performance; resist; Resist system;
resist system; Resist technologies; rule lithography;
scaled semiconductor devices; semiconductor devices;
Semiconductor logic; semiconductor logic;
shaped-electron-beam; system; technologies",
numericalindex = "Size 2.5E-07 to 5.0E-07 m",
thesaurus = "CMOS integrated circuits; Electron beam lithography;
Integrated circuit technology",
treatment = "P Practical; X Experimental",
}
@Article{Kienzle:1988:APS,
author = "M. G. Kienzle and Juan A. Garay and William H.
Tetzlaff",
title = "Analysis of page-reference strings of an interactive
system",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "523--535",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The performance of real-storage-management algorithms
in interactive systems suggests that locality of
reference extends to a significant degree across users'
transactions. This paper investigates this locality of
reference by analyzing page-reference strings gathered
from live systems. The data confirm the supposition:
They suggest that reference patterns are dominated by
system data references that are implied by the user's
commands. Program references appear to play only a
minor role. The user command sequence is an important
factor in the reference behavior of an interactive
session.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Thomas J. Watson Res. Center",
affiliationaddress = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems); C6120 (File
organisation)",
classification = "721; 722; 723; C6120 (File organisation); C6150J
(Operating systems)",
corpsource = "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer programming; computer systems, digital; data
references; data storage, digital; Interactive
Operation; Interactive session; interactive session;
interactive system; Interactive system; interactive
systems; live systems; Live systems; locality of
reference; management; management algorithms; operating
systems (computers); page-reference strings;
Page-reference strings; real-storage-;
Real-storage-management algorithms; Reference patterns;
reference patterns; sequence; storage; System data
references; system data references; user command; user
command sequence; User command sequence; users'
transactions; Users' transactions; users' transactions;
virtual storage",
thesaurus = "Interactive systems; Operating systems [computers];
Storage management; Virtual storage",
treatment = "P Practical",
}
@Article{Vassiliadis:1988:PEA,
author = "Stamatis Vassiliadis and Michael Putrino and Eric M.
Schwarz",
title = "Parallel Encrypted Array Multipliers",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "536--551",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "An algorithm for direct two's-complement and
sign-magnitude parallel multiplication is described.
The partial product matrix representing the
multiplication is converted to an equivalent matrix by
encryption. Its reduction, producing the final result,
needs no specialized adders and can be added with any
parallel array addition technique. It contains no
negative terms and no extra `correction' rows; in
addition, it produces the multiplication with fewer
than the minimal number of rows required for a direct
multiplication process.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Syst. Products Div.",
affiliationaddress = "IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5230 (Digital arithmetic methods)",
classification = "721; 723; 921; C5230 (Digital arithmetic methods)",
corpsource = "IBM, Syst. Products Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "computer metatheory; computers, digital; cryptography;
digital arithmetic; direct multiplication; Direct
two's-complement; direct two's-complement; encrypted
array; Encryption; encryption; equivalent matrix;
Equivalent matrix; mathematical techniques --- Matrix
Algebra; matrix algebra; multiplication; Multiplying
Circuits; parallel array addition; Parallel array
addition technique; parallel array addition technique;
parallel multiplication; partial product matrix;
Partial product matrix; product matrix; sign-magnitude
parallel; Sign-magnitude parallel multiplication;
two's-complement",
thesaurus = "Cryptography; Digital arithmetic; Matrix algebra",
treatment = "P Practical",
}
@Article{DiZenzo:1988:MLA,
author = "Silvano {Di Zenzo}",
title = "A many-valued logic for approximate reasoning",
journal = j-IBM-JRD,
volume = "32",
number = "4",
pages = "552--565",
month = jul,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new system of many-valued logic, the extended post
system of order p, P greater than equivalent to 2, is
proposed as a system of logic supporting reasoning with
facts and rules which are reliable to a specified
extent. In an extended post system there are as many
operations of logical disjunction and logical
conjunction as there are truth values. The truth value
associated with a particular operation of disjunction
(conjunction) acts as a threshold value controlling the
behavior of the operation. The availability of an
extended set of logical operations provides improved
flexibility in the symbolic translation of sentences
from the ordinary word-language. Extended post systems
are equipped with a semantics in which graded rather
than crisp sets correspond to predicates. The system
exhibits a `rich' algebraic structure. The p operations
of disjunction form a distributivity cycle. To each
disjunction there corresponds a dual operation of
conjunction, the two operations being distributive to
one another. The p conjunctions form a dual
distributivity cycle.",
acknowledgement = ack-nhfb,
affiliation = "IBM Italy",
affiliationaddress = "IBM Italy, Rome, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1230 (Artificial intelligence); C4210 (Formal
logic)",
classification = "721; 723; C1230 (Artificial intelligence); C4210
(Formal logic)",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approximate reasoning; Approximate reasoning;
approximate reasoning; artificial intelligence;
automata theory; computer metatheory; Extended Post;
Extended Post system; extended post system; Facts;
facts; knowledge engineering; logic design; Logical
conjunction; logical conjunction; Logical disjunction;
logical disjunction; logics; Many Valued Logics;
many-valued; many-valued logic; Many-valued logic;
Predicates; predicates; Reasoning; reasoning; rules;
Rules; semantics; Semantics; symbolic; Symbolic
translation; system; threshold value; Threshold value;
translation; truth value; truth values; Truth values;
word-language",
thesaurus = "Artificial intelligence; Knowledge engineering;
Many-valued logics",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Leidheiser:1988:ITT,
author = "Henry {Leidheiser, Jr.} and Richard D. Granata",
title = "Ion transport through protective polymeric coatings
exposed to an aqueous phase",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "582--590",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Protective polymeric coatings for metal and electrical
component surfaces are designed primarily to serve as
barriers for environmental constituents such as water,
oxygen and other atmospheric gases, and ions. The paper
describes the status of work in the laboratory to
develop an improved understanding of the chemical and
physical aspects of ion transport through polymeric
coatings which are exposed to an aqueous phase. The
ion-transport process may occur in the absence or
presence of an externally applied potential. Three
aspects of ion transport are discussed: methods used in
the laboratory to measure ion transport; the morphology
of polymeric coatings as related to ion transport; and
the chemical nature of an ion in a coating.",
acknowledgement = ack-nhfb,
affiliation = "Lehigh Univ., Bethlehem, PA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6630J (Diffusion, migration, and displacement of
impurities)A8160 (Corrosion, oxidation, etching, and
other surface treatments)",
classification = "A6630J (Diffusion, migration, and displacement of
impurities); A8160 (Corrosion, oxidation, etching, and
other surface treatments)",
corpsource = "Lehigh Univ., Bethlehem, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Aqueous phase; aqueous phase; chemical aspects;
Chemical aspects; coatings; design; diffusion in
solids; Electrical component surfaces; electrical
component surfaces; ion mobility; Ion-transport
process; ion-transport process; measurement; Metal
surface; metal surface; morphology; Morphology,
performance; Physical aspects; physical aspects;
polymer films; protective; protective polymeric;
Protective polymeric coatings",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Engineering",
thesaurus = "Diffusion in solids; Ion mobility; Polymer films;
Protective coatings",
treatment = "X Experimental",
}
@Article{OSullivan:1988:CPC,
author = "Eugene J. M. O'Sullivan and Jean Horkans and James R.
White and Judith M. Roldan",
title = "Characterization of {PdSn} catalysts for electroless
metal deposition",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "591--602",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A set of electrochemical techniques has been developed
to measure the component concentrations and the
catalytic activity of the PdSn seeder solutions used to
activate insulating substrates for the electroless
deposition of Cu. The concentration of Sn(II) was
calculated from the limiting current for Sn(II)
oxidation, that of Sn(IV) from the difference between
the Sn metal-deposition limiting current and the Sn(II)
limiting current. The palladium concentration was
determined by a stripping analysis after Pd deposition
from an oxidized seeder solution. The catalytic
activity of the PdSn catalyst was estimated by
measuring its activity for the electro-oxidation of
formaldehyde (the reducing agent used in the
electroless Cu bath) or by the cyclic voltammetric
response of a seeded electrode in an inert electrolyte.
The cyclic voltammetric technique and transmission
electron microscopy examination were used to evaluate
various accelerating solutions used to increase the
activity of the seeder.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/el; PdSn/bin Pd/bin Sn/bin",
classcodes = "A8115L (Deposition from liquid phases (melts and
solutions)); A8265J (Heterogeneous catalysis at
surfaces and other surface reactions); A8245
(Electrochemistry and electrophoresis)",
classification = "A8115L (Deposition from liquid phases (melts and
solutions)); A8245 (Electrochemistry and
electrophoresis); A8265J (Heterogeneous catalysis at
surfaces and other surface reactions)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "alloys; Catalyst; catalyst; catalysts; catalytic
activity; Catalytic activity; coatings; Component
concentrations; component concentrations; copper; Cu
deposition; cyclic voltammetric response; Cyclic
voltammetric response; design, Electroless metal
deposition; Electro-oxidation; electro-oxidation;
Electrochemical techniques; electrochemical techniques;
electrochemistry; electrode; electroless deposited;
electroless deposition; electroless metal deposition;
experimentation; formaldehyde; Formaldehyde; inert
electrolyte; Inert electrolyte; insulating; Insulating
substrates; materials; measurement; microscopy;
palladium alloys; PdSn seeder solutions; performance;
seeded; Seeded electrode; Stripping analysis; stripping
analysis; substrates; tin; transmission electron;
transmission electron microscope examination of;
Transmission electron microscopy",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Engineering \\ J.2 Computer Applications,
PHYSICAL SCIENCES AND ENGINEERING, Electronics",
thesaurus = "Catalysts; Copper; Electrochemistry; Electroless
deposited coatings; Electroless deposition; Palladium
alloys; Tin alloys; Transmission electron microscope
examination of materials",
treatment = "X Experimental",
}
@Article{Kovac:1988:CAI,
author = "C. A. Kovac and J. L. Jordan-Sweet and M. J. Goldberg
and J. G. Clabes and A. Viehbeck and R. A. Pollak",
title = "Chemistry at interfaces: Electropositive metals on
polymer surfaces",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "603--615",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper presents a study of chemical interactions
between polymer surfaces and metal atoms deposited from
the vapor phase. Such interactions may play an
important role in interfacial metal-polymer adhesion.
The chemical nature of the interface formed when an
electropositive metal (chromium or cesium) is deposited
onto the surface of PMDA-ODA polyimide has been
investigated using chemical model studies coupled with
photoelectron spectroscopic techniques. X-ray
photoelectron spectroscopy,
synchrotron-radiation-excited core-level photoemission,
and near-edge X-ray absorption spectroscopy were used
to analyze changes in polymer surfaces during
deposition of chromium and cesium. Chemical model
studies using cyclic voltammetry and UV-visible
spectroscopy were performed using several simpler
polymers or monomeric model compounds which contained
structural subunits of the polyimide. Results of these
experiments show that chromium (and other
electropositive metals studied so far) initially reacts
rapidly with the carbonyl groups of polyimide, causing
reduction of the dianhydride portion of the polymer,
with concomitant chromium oxidation. Continued
deposition of chromium onto the reacted polymer surface
results in the formation of chromium carbide, oxide,
and nitride species, indicating a disruption of the
polymer chemical structure.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cr/int Cr/el; Cs/int Cs/el",
classcodes = "A8265J (Heterogeneous catalysis at surfaces and other
surface reactions); A8280D (Electromagnetic radiation
spectrometry); A8115 (Methods of thin film deposition);
A8280P (Electron spectroscopy for chemical analysis
(photoelectron, Auger spectroscopy, etc.)); A8190
(Other topics in materials science); A8160J (Polymers
and plastics); A8280F (Electrochemical methods)",
classification = "A8115 (Methods of thin film deposition); A8160J
(Polymers and plastics); A8190 (Other topics in
materials science); A8265J (Heterogeneous catalysis at
surfaces and other surface reactions); A8280D
(Electromagnetic radiation spectrometry); A8280F
(Electrochemical methods); A8280P (Electron
spectroscopy for chemical analysis (photoelectron,
Auger spectroscopy, etc.))",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; analysis; caesium; carbonyl groups; Carbonyl
groups; chemical interactions; Chemical interactions;
chemical model; Chemical model; chromium; Cr; Cs;
cyclic voltammetry; Cyclic voltammetry; design, Vapour
phase deposition; excited core-level photoemission;
experimentation; interfacial metal-polymer adhesion;
Interfacial metal-polymer adhesion; measurement; metal
atoms; Metal atoms; monomeric model compounds;
Monomeric model compounds; near-edge X-ray absorption;
Near-edge X-ray absorption spectroscopy; performance;
photoelectron spectroscopic techniques; Photoelectron
spectroscopic techniques; PMDA-ODA polyimide; polymer
chemical; Polymer chemical structure; polymer surfaces;
Polymer surfaces; polymers; ray photoelectron
spectroscopy; spectrochemical; spectroscopy; structure;
surface chemistry; synchrotron-radiation-;
Synchrotron-radiation-excited core-level photoemission;
thin metal film deposition; Thin metal film deposition;
UV-visible spectroscopy; vapour deposited coatings;
vapour phase deposition; voltammetry (chemical
analysis); X-; X-ray photoelectron spectra; X-ray
photoelectron spectroscopy",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Chemistry \\ J.2 Computer Applications,
PHYSICAL SCIENCES AND ENGINEERING, Engineering",
thesaurus = "Adhesion; Caesium; Chromium; Polymers; Spectrochemical
analysis; Surface chemistry; Vapour deposited coatings;
Voltammetry [chemical analysis]; X-ray photoelectron
spectra",
treatment = "X Experimental",
}
@Article{Gotro:1988:CBT,
author = "Jeffrey T. Gotro and Bernd K. Appelt",
title = "Characterization of a bis-maleimide triazine resin for
multilayer printed circuit boards",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "616--625",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The thermosetting resin investigated in this study was
a mixture of bis-maleimide and bis-cyanate, frequently
referred to as BT (bis-maleimide triazine). For printed
circuit board applications, a brominated epoxy resin
was blended with BT to impart flame resistance. Resin
curing was extensively investigated using a combination
of thermoanalytical techniques (thermal analysis,
heated-cell infrared spectroscopy, dynamic mechanical
analysis, and microdielectrometry). Differential
scanning calorimetry indicated a minimum of two
separate reactions. Fourier-transform infrared
spectroscopy provided more detailed information on the
cross-linking reactions during the curing. The onset of
cyclotrimerization was found to appear at 150 degrees
C, correlating with one of the peaks observed in the
differential scanning calorimetry measurements. Dynamic
mechanical methods were used to investigate the
viscosity profile during simulated lamination
temperature profiles. Microdielectrometry performed
simultaneously with parallel-plate rheometry provided
further insight into the physical changes that occur
during lamination.",
acknowledgement = ack-nhfb,
affiliation = "IBM Systems Technol. Div., Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0560 (Polymers and plastics); B2210 (Printed
circuits)",
classification = "B0560 (Polymers and plastics); B2210 (Printed
circuits)",
corpsource = "IBM Systems Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "150 C; analysis; Bismaleimide triazine resin;
bismaleimide triazine resin; Brominated epoxy resin;
brominated epoxy resin; circuit boards; cross-linking
reactions; Cross-linking reactions; cyclotrimerization;
Cyclotrimerization; design, Differential scanning
calorimetry; dielectric; Dielectric loss; dielectric
losses; differential scanning calorimetry; dynamic;
Dynamic mechanical analysis; Dynamic mechanical method;
experimentation; flame resistance; Flame resistance;
Fourier-transform; Fourier-transform infrared
spectroscopy; glass transition (polymers); glass
transition temperature; Glass transition temperature;
heated-cell infrared spectroscopy; Heated-cell infrared
spectroscopy; infrared spectroscopy; lamination;
Lamination; loss; measurement; mechanical analysis;
mechanical method; Microdielectrometry;
microdielectrometry; multilayer printed; Multilayer
printed circuit boards; Parallel-plate rheometry;
parallel-plate rheometry; performance; polymers;
printed circuits; Resin curing; resin curing; simulated
lamination; Simulated lamination temperature profiles;
spectrochemical analysis; temperature profiles;
thermal; Thermal analysis; thermoanalytical techniques;
Thermoanalytical techniques; Thermosetting resin;
thermosetting resin; viscosity; viscosity profile;
Viscosity profile",
numericalindex = "Temperature 4.23E+02 K",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Dielectric losses; Glass transition [polymers];
Polymers; Printed circuits; Spectrochemical analysis;
Thermal analysis; Viscosity",
treatment = "X Experimental",
}
@Article{Ruoff:1988:IAC,
author = "Arthur L. Ruoff and Edward J. Kramer and Che-Yu Li",
title = "Improvement of adhesion of copper on polyimide by
reactive ion-beam etching",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "626--630",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors describe the effect of oxygen-reactive
ion-beam etching of a polyimide film to enhance its
adhesion to an overlying, subsequently deposited copper
film. The adhesion strength of the copper to the
polyimide could be increased by as much as a factor of
25 as a result of the etching. Near the etching
condition which resulted in optimum strength, the
failure mode at the polyimide/copper interface changed
from adhesive failure to tensile failure. The latter
occurred at the `roots' of a `grass-like' surface
structure of the ion-etched polyimide film.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "O/el; Cu/int Cu/el",
classcodes = "A8190 (Other topics in materials science); A8280D
(Electromagnetic radiation spectrometry); A8160J
(Polymers and plastics)",
classification = "A8160J (Polymers and plastics); A8190 (Other topics
in materials science); A8280D (Electromagnetic
radiation spectrometry)",
corpsource = "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; Adhesion strength; adhesion strength;
adhesive; Adhesive failure; Composition analysis;
composition analysis; copper; Cu; Cu film; design,
Scanning electron microscopy; experimentation; failure;
failure mode; Failure mode; film; measurement; O
reactive ion beam etching; performance; polyimide film;
Polyimide film; polymers; scanning electron microscopy;
spectrochemical analysis; spectroscopy; sputter
etching; Surface morphology; surface morphology;
tensile failure; Tensile failure; tensile strength;
X-ray photoemission; X-ray photoemission spectroscopy",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Adhesion; Copper; Polymers; Spectrochemical analysis;
Sputter etching; Tensile strength",
treatment = "X Experimental",
}
@Article{Ruoff:1988:DDP,
author = "Arthur L. Ruoff and Edward J. Kramer and Che-Yu Li",
title = "Developer-induced debonding of photoresist from
copper",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "631--635",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors describe the debonding of a polymeric
photoresist film bonded to a thin copper substrate as a
result of the diffusion of an organic penetrant into
the polymer. The diffusion profile (measured by
Rutherford backscattering spectroscopy) consisted of a
uniformly swollen layer behind a sharp front which
propagated into the polymer at a uniform velocity.
Debonding always occurred when the front had penetrated
about 12$\mu$m into the polymer (about 1/5 its
thickness). The debonding was driven by the release of
elastic strain energy created by the swelling.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/sur Cu/el",
classcodes = "B2550G (Lithography)",
classification = "B2550G (Lithography)",
corpsource = "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "12 Micron; 12 micron; Cu substrate; design, Developer
induced debonding; developer induced debonding;
diffusion; Diffusion profile; elastic; Elastic strain
energy release; experimentation; measurement; Organic
developer; organic developer; performance;
photoresists; polymeric photoresist film; Polymeric
photoresist film; polymers; profile; Rutherford
backscattering; Rutherford backscattering spectroscopy;
strain energy release; swelling; Swelling; swelling",
numericalindex = "Size 1.2E-05 m",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Photoresists; Polymers; Rutherford backscattering;
Swelling",
treatment = "X Experimental",
}
@Article{Pease:1988:PLU,
author = "R. F. Pease and O.-K. Kwon",
title = "Physical limits to the useful packaging density of
electronic systems",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "636--646",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Increasing the density of electronic circuits and
systems has been a major thrust for many years; the
benefits are increased speed, reduced power-delay
product, and reduced cost. Most of this effort has been
directed toward the chip, but during the last decade
system performance has been increasingly limited by
packaging, and so emphasis has been shifting in that
direction. Initially it was believed that heat
dissipation was a serious fundamental limit, but
advances in heat-sink technology have effectively
eliminated that concern. One of the most serious
problems is signal distribution. Although one can
fabricate submicron metal lines, such lines are not
normally practical as chip-to-chip interconnections
because their resistance leads to undue signal delay
and distortion; increasing their aspect ratio will
increase cross talk. It is not clear what constitutes
an optimal configuration, but for metals at room
temperature a signal-line pitch of 30 to 40$\mu$m
appears practical. For low temperatures, and especially
for superconducting lines, the pitch could be made very
much finer, leading to greatly improved system
density.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. Eng., Stanford Univ., CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2570 (Semiconductor
integrated circuits)",
classification = "B0170J (Product packaging); B2570 (Semiconductor
integrated circuits)",
corpsource = "Dept. of Electr. Eng., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "30 to 40 micron; 30 To 40 micron; aspect; Aspect
ratio; chip-; Chip-to-chip interconnections; design,
Electronic circuit density; dissipation; distortion;
Distortion; electronic circuit density; heat; Heat
dissipation; heat sinks; heat-sink technology;
Heat-sink technology; integrated circuit technology;
measurement; optimal configuration; Optimal
configuration; packaging; packaging density; Packaging
density; performance; ratio; signal delay; Signal
delay; signal distribution; Signal distribution;
signal-line pitch; Signal-line pitch; superconducting
lines; Superconducting lines; to-chip interconnections;
VLSI",
numericalindex = "Size 3.0E-05 to 4.0E-05 m",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Heat sinks; Integrated circuit technology; Packaging;
VLSI",
treatment = "P Practical",
}
@Article{Chang:1988:EDS,
author = "C. S. Chang",
title = "Electrical design of signal lines for multilayer
printed circuit boards",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "647--657",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Key aspects of the electrical design of signal lines
for multilayer printed circuit boards used in computers
are examined. Illustrative calculations are carried out
for several signal-line configurations, and associated
means are presented for selecting design trade-offs
regarding cross talk and skin-effect-induced delay.",
acknowledgement = ack-nhfb,
affiliation = "IBM Syst. Technol. Div., Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210B (Printed circuit layout and design)",
classification = "B2210B (Printed circuit layout and design)",
corpsource = "IBM Syst. Technol. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computers; Computers; cross talk; Cross talk; design,
Electrical design; effect-induced delay; electrical
design; measurement; multilayer printed circuit boards;
Multilayer printed circuit boards; performance; printed
circuit design; signal-line configurations; Signal-line
configurations; skin-; Skin-effect-induced delay",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Printed circuit design",
treatment = "P Practical",
}
@Article{Ho:1988:DBA,
author = "P. S. Ho and B. D. Silverman and R. A. Haight and R.
C. White and P. N. Sanda and A. R. Rossi",
title = "Delocalized bonding at the metal-polymer interface",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "658--668",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper summarizes the current understanding of the
nature of the chemical bond formed at the interface
between a deposited metal atom and an underlying
polyimide surface. The approach in these studies is
based on the use of quantum chemical calculations to
interpret photoemission spectroscopy results. By
focusing on the initial reaction between a chromium
atom and the PMDA-ODA polyimide repeat unit, the
bonding is demonstrated to be delocalized, arising from
the formation of a charge-transfer complex between the
metal atom and the PMDA unit of the polyimide.
Stabilization of the complex involves the transfer of
electronic charge from the metal d states of chromium
to the lowest unoccupied molecular orbital of the pi
system of the PMDA unit of the polyimide. The complex
proposed is energetically favored over that involving a
direct local interaction between the chromium atom and
one of the carbonyl functional groups. The distribution
of single-particle electron energy levels deduced from
molecular-orbital calculations can account for the
spectroscopy results. The formation of such delocalized
metal-polymer complexes is also inferred from a related
study of the chromium/PMDA-PDA interface.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cr/int Cr/el",
classcodes = "A7320J (Delocalization processes); A7960G (Composite
surfaces); A3120 (Specific calculations and results);
A3520G (Bond strengths, dissociation energies, hydrogen
bonding)",
classification = "A3120 (Specific calculations and results); A3520G
(Bond strengths, dissociation energies, hydrogen
bonding); A7320J (Delocalization processes); A7960G
(Composite surfaces)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bonds (chemical); calculations; carbonyl functional
groups; Carbonyl functional groups; charge-transfer
complex; Charge-transfer complex; chemical bond;
Chemical bond; chromium; Cr; Cr-PMDA-PDA interface;
delocalised bonding; delocalized metal-polymer
complexes; Delocalized metal-polymer complexes; design,
Single particle electron energy level distribution
delocalised bonding; direct local; Direct local
interaction; interaction; interface electron states;
measurement; molecular orbitals calculations;
molecular-orbital; Molecular-orbital calculations;
performance; photoelectron spectra; photoemission;
Photoemission spectroscopy; pi system; Pi system;
PMDA-ODA polyimide; PMDA-ODA-; PMDA-ODA-Cr; polymers;
quantum chemical calculations; Quantum chemical
calculations; single particle electron energy level
distribution; spectroscopy; ultraviolet; unoccupied
molecular orbital; Unoccupied molecular orbital; UV
photoemission spectroscopy; X-ray photoelectron
spectra; X-ray photoelectron spectroscopy",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics",
thesaurus = "Bonds [chemical]; Chromium; Interface electron states;
Molecular orbitals calculations; Polymers; Ultraviolet
photoelectron spectra; X-ray photoelectron spectra",
treatment = "X Experimental",
}
@Article{Auerbach:1988:SAC,
author = "D. J. Auerbach and C. R. Brundle and D. C. Miller",
title = "Surface analysis and characterization of large
printed-circuit-board circuitization process steps",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "669--681",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors describe the use of surface-analysis
techniques to characterize problems encountered in
1980-1981 in the fabrication of large printed circuit
boards for the IBM 3081 processor unit. XPS, AES, SAM,
SEM, and optical microscopy techniques were used. The
two major areas addressed were (a) corrosion at a
photoresist/Cu foil interface during electroless Cu
plating of circuit lines which resulted in defects in
subsequently formed Cu lines, and (b) surface-chemical
aspects of a `single-seed' colloidal Pd/Sn catalytic
initiation of electroless Cu plating onto epoxy
surfaces. The corrosion mechanism responsible for the
line defects was identified, and corrective actions
suggested. Changes in surface composition (Pd/Sn
ratio), and surface chemical state (Pd$^0$Pd$^{2+}$,
Sn$^0$Sn$^{2+,4+}$) as a function of process step were
correlated with plating effectiveness and led to a
means of increasing the surface Pd$^0$Sn ratio by as
much as an order of magnitude.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el; PdSn/bin Pd/bin Sn/bin",
classcodes = "B2210D (Printed circuit manufacture)",
classification = "B2210D (Printed circuit manufacture)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AES; aspects; Auger effect; chemical state; circuit
lines; Circuit lines; corrosion; Corrosion; Cu; design,
Pd/Sn ratio; electroless Cu plating; Electroless Cu
plating; epoxy surfaces; Epoxy surfaces;
experimentation; IBM 3081; IBM 3081 processor unit;
large printed-circuit-board circuitization; Large
printed-circuit-board circuitization process steps;
measurement; optical microscopy; Optical microscopy
techniques; Pd/Sn ratio; PdSn catalyst; performance;
photoelectron spectra; photoresist/Cu foil interface;
Photoresist/Cu foil interface; photoresists; plating
effectiveness; Plating effectiveness; printed circuit
manufacture; process steps; processor unit; SAM;
scanning electron microscopy; SEM; surface; Surface
chemical state; surface composition; Surface
composition; surface structure; surface-analysis
techniques; Surface-analysis techniques;
surface-chemical; Surface-chemical aspects; techniques;
X-ray; X-ray chemical analysis; XPS",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Electronics \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS",
thesaurus = "Auger effect; Corrosion; Optical microscopy;
Photoresists; Printed circuit manufacture; Scanning
electron microscopy; Surface structure; X-ray chemical
analysis; X-ray photoelectron spectra",
treatment = "X Experimental",
}
@Article{Berry:1988:EVB,
author = "B. S. Berry and W. C. Pritchet",
title = "Elastic and viscoelastic behavior of a magnetic
recording tape",
journal = j-IBM-JRD,
volume = "32",
number = "5",
pages = "682--694",
month = sep,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The mechanical behavior of a trilayer Mylar-based
magnetic recording tape has been studied by three
complementary methods, applied either to the complete
tape or to samples prepared by the selective removal of
its front or back coatings. One method provided tensile
stress-strain and creep data, another exploited the
phenomenon of thermal curling, and a third or mandrel
method was used to measure relaxation and recovery in
simple bending. Despite the large relative thickness of
the Mylar substrate, both the initial stiffness and
subsequent relaxation behavior of the tape were
strongly influenced by the surface magnetic coatings,
and particularly by the oriented and calendered
frontcoat, which exhibited elastic anisotropy and an
enhanced longitudinal Young's modulus of up to five
times that of the Mylar core. As a consequence, the
magnetically active frontcoat emerged as the most
highly stressed component of the tape, and initially
supported almost half of an imposed tensile load. The
high initial modulus of the oriented and calendered
frontcoat was attributed to the reinforcement provided
by the magnetic oxide dispersed in the polymeric
frontcoat binder. The substantial viscoelastic behavior
of the coatings was also linked to their composite
structure, and specifically to the ability of the
binder to relax the enhanced initial modulus conferred
by the presence of the oxide.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B0560 (Polymers and
plastics); B0590 (Materials testing)",
classification = "B0560 (Polymers and plastics); B0590 (Materials
testing); B3120B (Magnetic recording)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "behavior; creep; creep data; Creep data; design;
elastic anisotropy; Elastic anisotropy; enhanced
longitudinal Young's modulus; Enhanced longitudinal
Young's modulus; initial stiffness; Initial stiffness;
magnetic anisotropy; magnetic tapes; mandrel; Mandrel
method; measurement; mechanical; Mechanical behavior;
method; Mylar substrate; polymer films; polymer
substrate; Polymer substrate; relaxation; Relaxation
behavior; surface magnetic coatings; Surface magnetic
coatings; tensile load; Tensile load, performance;
tensile strength; tensile stress-strain; Tensile
stress-strain; thermal curling; Thermal curling;
trilayer Mylar-based magnetic recording tape; Trilayer
Mylar-based magnetic recording tape; viscoelastic
behavior; Viscoelastic behavior; viscoelasticity;
Young's modulus",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Engineering \\ J.2 Computer Applications,
PHYSICAL SCIENCES AND ENGINEERING, Electronics",
thesaurus = "Creep; Magnetic anisotropy; Magnetic tapes; Polymer
films; Tensile strength; Viscoelasticity; Young's
modulus",
treatment = "X Experimental",
}
@Article{Pennebaker:1988:OBP,
author = "William B. Pennebaker and Joan L. Mitchell and Glen G.
{Langdon, Jr.} and Ronald B. Arps",
title = "An overview of the basic principles of the {Q}-coder
adaptive binary arithmetic coder",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "717--726 (or 206--211??)",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Q-Coder is a new form of adaptive binary
arithmetic coding. The binary arithmetic coding part of
the technique is derived from the basic concepts
introduced by Rissanen, Pasco, and Langdon, but extends
the coding conventions to resolve a conflict between
optimal software and hardware implementations. In
addition, a robust form of probability estimation is
used in which the probability estimate is derived
solely from the interval renormalizations that are part
of the arithmetic coding process. A brief tutorial of
arithmetic coding concepts is presented, followed by a
discussion of the compatible optimal hardware and
software coding structures and the estimation of symbol
probabilities from interval renormalization.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6110 (Information theory); C5230
(Digital arithmetic methods); C1260 (Information
theory); C4220 (Automata theory)",
classification = "704; 722; 723; 921; 922; B6110 (Information theory);
B6120B (Codes); C1260 (Information theory); C4220
(Automata theory); C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Binary Arithmetic Coder; Codes, Symbolic; Coding
conventions; coding conventions; Compatible Optimal
Hardware; Computer Hardware; Computer Metatheory;
Computer Software; digital arithmetic; encoding; finite
automata; hardware coding; Hardware coding;
information; interval; Interval Renormalization;
Interval renormalizations; Mathematical Techniques;
Performance; probability; probability estimation;
Probability estimation; Probability--Estimation;
Q-Coder; Q-coder adaptive binary arithmetic coder;
renormalizations; Software coding; Software Coding;
software coding; superconducting devices; Symbol
Probabilities; Symbol probabilities; symbol
probabilities; theory",
thesaurus = "Digital arithmetic; Encoding; Finite automata;
Information theory; Probability",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Mitchell:1988:OHS,
author = "Joan L. Mitchell and William B. Pennebaker",
title = "Optimal hardware and software arithmetic coding
procedures for the {Q-Coder}",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "727--736",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Q-Coder is an important new development in
arithmetic coding. It combines a simple but efficient
arithmetic approximation for the multiply operation, a
new formalism which yields optimally efficient hardware
and software implementations, and a new form of
probability estimation. This paper describes the
concepts which allow different, yet compatible, optimal
software and hardware implementations. In prior binary
arithmetic coding algorithms, efficient hardware
implementations favored ordering the more probable
symbol (MPS) above the less probable symbol (LPS) in
the current probability interval. Efficient software
implementation required the inverse ordering
convention. It is shown that optimal hardware and
software encoders and decoders can be achieved with
either symbol ordering. Although optimal implementation
for a given symbol ordering requires the hardware and
software code strings to point to opposite ends of the
probability interval, either code string can be
converted to match the other exactly. A code string
generated using one symbol-ordering convention can be
inverted so that it exactly matches the code string
generated with the inverse convention. Even where bit
stuffing is used to block carry propagation, the code
strings can be kept identical.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6110 (Information theory); C5230
(Digital arithmetic methods); C1260 (Information
theory); C4220 (Automata theory)",
classification = "722; 723; 921; 922; B6110 (Information theory);
B6120B (Codes); C1260 (Information theory); C4220
(Automata theory); C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approximation; arithmetic; Arithmetic approximation;
arithmetic coding; Arithmetic coding; Arithmetic
Coding; Codes, Symbolic; Coding Algorithms; Computer
Hardware; Computer Software; Decoders; decoders;
digital arithmetic; encoding; estimation; finite
automata; Formalism; formalism; Hardware coding;
hardware coding; hardware implementations; Hardware
implementations; information; inverse; Inverse ordering
convention; Less probable symbol; less probable symbol;
Mathematical Techniques; more probable symbol; More
probable symbol; Multiply operation; multiply
operation; Multiply Operation; ordering convention;
Performance; probability; Probability; Probability
estimation; Probability Interval; Q-Coder; Q-coder;
software implementation; Software implementation;
Symbol Ordering; theory",
thesaurus = "Digital arithmetic; Encoding; Finite automata;
Information theory; Probability",
treatment = "T Theoretical or Mathematical",
}
@Article{Pennebaker:1988:PEQ,
author = "William B. Pennebaker and Joan L. Mitchell",
title = "Probability estimation for the {Q-Coder}",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "737--752",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Q-Coder is an important new development in binary
arithmetic coding. It combines a simple but efficient
arithmetic approximation for the multiply operation, a
new formalism which yields optimally efficient hardware
and software implementations, and a new technique for
estimating symbol probabilities which matches the
performance of any method known. This paper describes
the probability-estimation technique. The probability
changes are estimated solely from renormalizations in
the coding process and require no additional counters.
The estimation process can be implemented as a
finite-state machine, and is simple enough to allow
precise theoretical modeling of single-context coding.
Approximate models have been developed for a more
complex multi-rate version of the estimator and for
mixed-context coding. Experimental studies verifying
the modeling and showing the performance achieved for a
variety of image-coding models are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6110 (Information theory); C5230
(Digital arithmetic methods); C1260 (Information
theory); C4220 (Automata theory)",
classification = "721; 723; 921; 922; B6110 (Information theory);
B6120B (Codes); C1260 (Information theory); C4220
(Automata theory); C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Automata Theory; Binary Arithmetic Coding; Binary
arithmetic coding; binary arithmetic coding; Codes,
Symbolic; context coding; digital arithmetic; encoding;
estimation technique; finite automata; finite-state;
Finite-state machine; Hardware coding; hardware coding;
Image-coding models; image-coding models;
implementations; information; machine; mixed-;
Mixed-Context Coding; Mixed-context coding; multi-rate
version; Multi-rate version; multiply; Multiply
operation; operation; Optimally efficient hardware;
optimally efficient hardware; Performance; probability;
Probability Changes; probability-;
Probability--Estimation; Probability-estimation
technique; Q-coder; Q-Coder; Renormalizations;
renormalizations; Single-context coding; single-context
coding; Single-Context Coding; software; Software
implementations; Symbol probabilities; symbol
probabilities; Symbol Probabilities; theory",
thesaurus = "Digital arithmetic; Encoding; Finite automata;
Information theory; Probability",
treatment = "T Theoretical or Mathematical",
}
@Article{Mitchell:1988:SIQ,
author = "Joan L. Mitchell and William B. Pennebaker",
title = "Software implementations of the {Q-Coder}",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "753--774",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The Q-Coder is an important new development in
arithmetic coding. It combines a simple but efficient
arithmetic approximation for the multiply operation, a
new formalism which yields optimally efficient hardware
and software implementations, and a new technique for
estimating symbol probabilities which matches the
performance of any method known. This paper describes
implementations of the Q-Coder following both the
hardware and software paths. Detailed flowcharts are
given.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6110 (Information theory); C5230
(Digital arithmetic methods); C1260 (Information
theory); C4220 (Automata theory)",
classification = "722; 723; 921; 922; B6110 (Information theory);
B6120B (Codes); C1260 (Information theory); C4220
(Automata theory); C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "approximation; arithmetic; Arithmetic approximation;
arithmetic coding; Arithmetic coding; Arithmetic
Coding; Codes, Symbolic; Computer Hardware; Computer
Software; digital arithmetic; efficient hardware;
encoding; finite automata; Flowcharts; flowcharts;
Formalism; formalism; Hardware coding; hardware coding;
information; Mathematical Techniques; multiply
operation; Multiply operation; optimally; Optimally
efficient hardware; Performance; probabilities;
probability; Probability--Estimation; Q-Coder; Q-coder;
Software implementations; software implementations;
symbol; Symbol probabilities; Symbol Probabilities;
theory",
thesaurus = "Digital arithmetic; Encoding; Finite automata;
Information theory; Probability",
treatment = "T Theoretical or Mathematical",
}
@Article{Arps:1988:MVC,
author = "Ronald B. Arps and Thomas K. Truong and David J. Lu
and Richard C. Pasco and Theodore David Friedman",
title = "A multi-purpose {VLSI} chip for adaptive data
compression of bilevel images",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "775--795 (or 775--794??)",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A VLSI chip for data compression has been implemented
based on a general-purpose adaptive binary arithmetic
coding (ABAC) architecture. The architecture permits
the reuse of adapter and arithmetic coder logic in a
universal way, which together with application
-specific model logic can create a variety of powerful
compression systems. The specific version of the
adapter\slash coder used is the `Q-Coder'. The hardware
implementation is in a single HCMOS chip, to maximize
speed and minimize cost. The primary purpose of the
chip is to provide superior data compression
performance for bilevel image data by using conditional
binary source models together with adaptive arithmetic
coding. The coding scheme implemented is called the
Adaptive Bilevel Image Compression (ABIC) algorithm. On
business documents, it outperforms such nonadaptive
algorithms as the CCITT Group 4 (T.6) Standard and
comes into its own when adapting to documents scanned
at different resolutions or which include significantly
different data such as digital halftones.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center",
affiliationaddress = "San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); B6110 (Information theory); B6140C
(Optical information and image processing); C5230
(Digital arithmetic methods); C1260 (Information
theory); C4220 (Automata theory)C1250 (Pattern
recognition)",
classification = "713; 714; 721; 723; 741; 921; B6110 (Information
theory); B6120B (Codes); B6140C (Optical information
and image processing); C1250 (Pattern recognition);
C1260 (Information theory); C4220 (Automata theory);
C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Adapter; adapter; Adaptive arithmetic coding; adaptive
arithmetic coding; Adaptive binary arithmetic coding;
adaptive binary arithmetic coding; Adaptive Binary
Arithmetic Coding (ABAC); Adaptive data compression;
Adaptive Data Compression; adaptive data compression;
Arithmetic coder logic; arithmetic coder logic;
Arithmetic Coder Logic; Bilevel Images; bilevel images;
Bilevel images; binary source; Binary source models;
Control Systems, Adaptive; Design; digital arithmetic;
encoding; finite automata; hardware coding; Hardware
coding; HCMOS chip; Image Processing; information;
Information Theory--Data Compression; Integrated
Circuits, VLSI; models; picture processing;
probability; Q-Coder; Q-coder; theory; VLSI; VLSI chip;
VLSI Chip",
thesaurus = "Digital arithmetic; Encoding; Finite automata;
Information theory; Picture processing; Probability;
VLSI",
treatment = "A Application; P Practical; T Theoretical or
Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Thiebaut:1988:FDI,
author = "Dominique Thiebaut",
title = "From the fractal dimension of the intermiss gaps to
the cache-miss ratio",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "796--803",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This work extends a model proposed by Voldman,
Mandelbrot, et al. on the fractal nature of the gaps
separating cache misses, and shows how the fractal
dimension of the gap distribution can be used to
predict the miss ratio experienced by the program that
has generated the series of cache misses. This result
supports the thesis that the fractal dimension of the
distribution of the intermiss gaps is a potentially
powerful measure for program characterization.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Comput. Sci., Smith Coll.",
affiliationaddress = "Northampton, MA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "721; 722; 723; C6120 (File organisation)",
corpsource = "Dept. of Comput. Sci., Smith Coll., Northampton, MA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "buffer storage; Cache-miss ratio; Cache-Miss Ratio;
cache-miss ratio; Computer Metatheory; Computer
Software; Data Storage, Digital; Fractal dimension;
fractal dimension; Fractal Dimension; fractals; Gap
Distribution; Gap distribution; gap distribution;
intermiss gaps; Intermiss gaps; Intermiss Gaps; Memory
access pattern; memory access pattern; Memory Caches;
Program characterization; Program Characterization;
program characterization; storage management",
thesaurus = "Buffer storage; Fractals; Storage management",
treatment = "T Theoretical or Mathematical",
}
@Article{Ghez:1988:KFS,
author = "Richard Ghez and Subramanian S. Iyer",
title = "The kinetics of fast steps on crystal surfaces and its
application to the molecular beam epitaxy of silicon",
journal = j-IBM-JRD,
volume = "32",
number = "6",
pages = "804--818",
month = nov,
year = "1988",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Crystal growth by molecular beam epitaxy (MBE) occurs
under conditions of high supersaturation. The classic
growth theory of Burton, Cabrera, and Frank is based on
the assumption that surface steps move slowly.
Consequently, it requires modifications to be
applicable to MBE because the velocities of surface
steps may be large. Because such steps are asymmetric
structures, as observed experimentally by field ion
microscopy, capture probabilities from above and from
below a step must differ markedly. Hence the adatom
concentration distribution cannot be at equilibrium at
steps; there, it also suffers a discontinuity. We
propose a model that treats surface step motion as a
Stefan problem and that also respects its physical
asymmetry. Calculations are presented which extend and
complete recently published results that had imposed
the restrictive condition of local equilibrium at
steps. Step velocity is estimated as a function of
supersaturation, degree of asymmetry, and step density.
Concentration profiles are then computed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A8115G (Vacuum deposition); A6820 (Solid surface
structure); B0510D (Epitaxial growth); B2520C
(Elemental semiconductors)",
classification = "549; 712; 933; A6820 (Solid surface structure);
A6855 (Thin film growth, structure, and epitaxy);
A8115G (Vacuum deposition); B0510D (Epitaxial growth);
B2520C (Elemental semiconductors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Adatom Concentration Distribution; Adatom
concentration distribution; adatom concentration
distribution; capture; Capture probabilities; Capture
Probabilities; Crystal surfaces; crystal surfaces;
Crystals--Epitaxial Growth; elemental semiconductors;
epitaxy; Fast steps; fast steps; Field ion microscopy;
field ion microscopy; Growth; Kinetics; kinetics; Local
Equilibrium; MBE; molecular beam; molecular beam
epitaxial growth; Molecular beam epitaxy; Molecular
Beam Epitaxy; probabilities; problem; Semiconducting
Silicon; semiconductor epitaxial layers; semiconductor
growth; Si; silicon; Stefan; Stefan problem; Stefan
Problem; Step Velocity; Supersaturation;
supersaturation; Surface Steps; surface structure",
thesaurus = "Elemental semiconductors; Molecular beam epitaxial
growth; Semiconductor epitaxial layers; Semiconductor
growth; Silicon; Surface structure",
treatment = "B Bibliography; T Theoretical or Mathematical",
}
@Article{Benson:1989:DSB,
author = "Richard C. Benson and Chisin Chiang and Frank E.
Talke",
title = "The dynamics of slider bearings during contacts
between slider and disk",
journal = j-IBM-JRD,
volume = "33",
number = "1",
pages = "2--14",
month = jan,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The dynamics of a `mini-Winchester' magnetic recording
slider are studied during contacts with a hard,
rotating memory disk using numerical simulation. An
on-line solution of the Reynolds equation is used to
calculate the air-film pressure and a
`coefficient-of-restitution' model is used to describe
intermittent slider\slash disk contacts. Studies are
made to identify system configurations which reduce the
possibility of a `head crash' during contact
start\slash stop.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Mech. Eng., Rochester Univ.",
affiliationaddress = "Rochester, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media)",
classification = "421; 601; 721; 722; B3120B (Magnetic recording);
C5320C (Storage on moving magnetic media)",
corpsource = "Dept. of Mech. Eng., Rochester Univ., NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Air-Film Pressure; Bearings--Mechanical Properties;
configurations; Contact start/stop; contact start/stop;
Data Storage, Magnetic; Disk; Dynamics; dynamics;
equation; hard discs; Hard disk; hard disk;
Intermittent slider/disk contacts; intermittent
slider/disk contacts; Magnetic Recording; magnetic
recording; Magnetic recording slider; Memory Disk;
On-line solution; on-line solution; Reynolds; Reynolds
Equation; Reynolds equation; Rotating memory disk;
rotating memory disk; slider; Slider bearings; Slider
Bearings; slider bearings; Slider/Disk Contacts;
system; System configurations",
thesaurus = "Hard discs",
treatment = "P Practical",
}
@Article{Matick:1989:FCC,
author = "Richard E. Matick",
title = "Functional cache chip for improved system
performance",
journal = j-IBM-JRD,
volume = "33",
number = "1",
pages = "15--32",
month = jan,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of a cache to improve the performance of
computing systems is becoming pervasive, from
microprocessors to high-end systems. The general
approach has traditionally been to use ordinary fast
RAM chips and interface these close to the processor
for speed. However, this is far from the ideal
solution. The stringent and often conflicting
requirements on the cache bandwidth for servicing the
processor and minimizing reload time can severely limit
attainable performance. The cache need not be the
performance-limiting factor if a properly integrated
functional cache chip is used. This paper defines the
requirements of a cache subsystem and shows how these
have been or could be implemented in typical systems.
The functional requirements of an optimal cache chip
design are presented and illustrated.",
acknowledgement = ack-nhfb,
affiliation = "Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); C5320G (Semiconductor
storage)",
classification = "714; 721; 722; B1265D (Memory circuits); C5320G
(Semiconductor storage)",
corpsource = "Thomas J. Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "buffer storage; Cache bandwidth; Cache Bandwidth;
cache bandwidth; Cache Subsystem; Chip design; chip
design; Computing systems; computing systems; Data
Storage, Digital; Functional Cache Chip; integrated
functional cache chip; Integrated functional cache
chip; integrated memory circuits; Logic Devices; Memory
Chips; ram Chips; Random Access; Reload time; reload
time; system performance; System performance",
thesaurus = "Buffer storage; Integrated memory circuits",
treatment = "A Application; P Practical",
}
@Article{Paul:1989:MEI,
author = "Clayton R. Paul",
title = "Modeling electromagnetic interference properties of
printed circuit boards",
journal = j-IBM-JRD,
volume = "33",
number = "1",
pages = "33--50",
month = jan,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The mathematical modeling of a printed circuit board
(PCB) for the prediction of its electromagnetic
interference (EMI) properties is investigated. Two key
aspects examined are crosstalk and the high-frequency
voltage developed between the ends of a PCB land
(ground drop). The notion of partial inductance as
opposed to loop inductance is the key to predicting the
high-frequency voltage that are developed between two
ends of a land. Crosstalk predictions are a by-product
of the modeling. Experimental results illustrate the
accuracy of the model. A technique for the accurate
measurement of the high-frequency voltage developed
between two ends of a PCB land is described and
explained in terms of partial inductances.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. Eng., Kentucky Univ.",
affiliationaddress = "Lexington, KY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210B (Printed circuit layout and design); B5230
(Electromagnetic compatibility and interference)",
classification = "701; 703; 711; 713; 714; B2210B (Printed circuit
layout and design); B5230 (Electromagnetic
compatibility and interference)",
corpsource = "Dept. of Electr. Eng., Kentucky Univ., Lexington, KY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "boards; Crosstalk; crosstalk; Crosstalk Predictions;
Electromagnetic Compatibility; Electromagnetic
Interference; electromagnetic interference;
Electromagnetic interference properties;
electromagnetic interference properties; EMI; frequency
voltage; Ground drop; ground drop; high-;
High-frequency voltage; High-Frequency Voltage;
high-frequency voltage; inductance; loop inductance;
Loop inductance; Mathematical modeling; mathematical
modeling; Mathematical Models; partial; Partial
inductance; Partial Inductance; PCB land; printed
circuit; Printed Circuit Boards; Printed circuit
boards; printed circuit design; Printed Circuits;
Signal Interference--Crosstalk",
thesaurus = "Electromagnetic interference; Printed circuit design",
treatment = "X Experimental",
}
@Article{Tetzlaff:1989:ABS,
author = "William H. Tetzlaff and Martin G. Kienzle and Juan A.
Garay",
title = "Analysis of block-paging strategies",
journal = j-IBM-JRD,
volume = "33",
number = "1",
pages = "51--59",
month = jan,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The performance of interactive paging systems in
general and Virtual Machine/System Product (VM/SP)
systems with the High Performance Option (HPO) in
particular depends upon locality of reference. This
storage-management dependency, often considered in the
context of individual programs, extends in fact to a
significant degree across most virtual-machine
transactions. This paper investigates strategies to
exploit locality of reference at the system level by
analyzing page-reference strings gathered from live
systems. Alternative strategies are evaluated using
trace-driven simulations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation)",
classification = "721; 722; 723; C6120 (File organisation)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Block-Paging Strategies; Block-paging strategies;
block-paging strategies; Computer Programming; Data
Processing; Data Storage, Digital; High Performance
Option; Interactive Paging; interactive paging systems;
Interactive paging systems; Live systems; live systems;
Machine/System Product; management dependency; page-;
Page-Reference Strings; Page-reference strings;
reference strings; storage management; storage-;
Storage-Management Dependency; Storage-management
dependency; Trace-Driven Simulations; Trace-driven
simulations; trace-driven simulations; Virtual; Virtual
Machine/System Product; virtual storage;
Virtual-machine transactions; virtual-machine
transactions; Virtual-Machine Transactions",
thesaurus = "Storage management; Virtual storage",
treatment = "P Practical",
}
@Article{Howell:1989:SPS,
author = "Thomas D. Howell",
title = "Statistical properties of selected recording codes",
journal = j-IBM-JRD,
volume = "33",
number = "1",
pages = "60--73 (or 15--32??)",
month = jan,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94B60",
MRnumber = "89k:94080",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Most recording systems encode their data using binary
run-length-limited (RLL) codes. Statistics such as the
density of 1s, the probabilities of specific code
strings or run lengths, and the power spectrum are
useful in analyzing the performance of RLL codes in
these applications. These statistics are easy to
compute for ideal run-length-limited codes, those whose
only constraints are the run-length limits, but ideal
RLL codes are not usable in practice because their code
rates are irrational. Implemented RLL codes achieve
rational rates by not using all code sequences which
satisfy the run-length constraints, and their
statistics are different from those of the ideal RLL
codes. Little attention has been paid to the
computation of statistics for these practical codes. A
method is presented for computing statistics of
implemented codes. The key step is to develop an exact
description of the code sequences which are used. A
consequence of the code having rational rate is that
all the code-string and run-length probabilities are
rational. The method is illustrated by applying it to
three codes of practical importance: MFM, (2, 7), and
(1, 7).",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center",
affiliationaddress = "San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C5320K
(Optical storage)",
classification = "714; 721; 722; 723; 922; C5320C (Storage on moving
magnetic media); C5320K (Optical storage)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(1,7) Codes; (1,7) codes; (2,7) codes; (2,7) Codes;
Analysis; binary; Binary run-length-limited; Binary
Run-Length-Limited (RLL) Codes; Cache Bandwidth; Cache
Subsystem; code; Code rates; Code sequences; Code
Sequences; code sequences; code strings; Code Strings;
Code strings; codes; Codes, Symbolic; Data Storage,
Digital; Functional Cache Chip; Logic Devices; magnetic
recording; Memory Chips; MFM; optical storage; power
spectrum; Power spectrum; probabilities; ram Chips;
Random Access; rates; Rational rate; rational rate;
Rational Rates; Recording Codes; run-length; Run-Length
Probabilities; Run-length probabilities;
run-length-limited; selected recording codes; Selected
recording codes; Statistical Methods; Statistics;
statistics",
reviewer = "L. L. Campbell",
thesaurus = "Codes; Magnetic recording; Optical storage",
treatment = "P Practical; T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Jayaraman:1989:GTV,
author = "Rangarajan Jayaraman and Vijay Srinivasan",
title = "Geometric tolerancing. {I}. {Virtual} boundary
requirements",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "90--104",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68U05",
MRnumber = "993 626",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "679.68201",
abstract = "We examine the representation of geometric tolerances
in solid-geometric models from the perspective of two
classes of functional requirements. The first class
deals with positioning of parts with respect to one
another in an assembly, and the second with maintaining
material bulk in critical portions of parts. Both are
directly relatable to the geometry of the parts.
Through examples, we demonstrate that these functional
requirements can be captured in a specific form of
tolerances designated as virtual boundary requirements
(VBRs). We further demonstrate that the only proposed
theory of tolerances in solid models, and the current
dimensioning and tolerancing standards in industrial
practice, are both inadequate for dealing with VBRs.
Accordingly, we develop a theoretical basis for the
rigorous statement and interpretation of VBRs.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering)",
classification = "601; 921; B0170C (Project and design engineering)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Assembly; Assembly Functional Requirements;
boundary-value problems; design engineering;
functional; Functional requirements; geometric
tolerances; Geometric tolerances; Geometric
Tolerancing; Material bulk; material bulk; Material
Bulk Requirements; Mathematical Techniques--Geometry;
Mechanical Product Design; modelling; positioning;
Positioning; Product Design; requirements; Solid
Geometric Models; solid-geometric models;
Solid-geometric models; theory; tolerances; Tolerances,
design; virtual boundary; Virtual Boundary
Requirements; Virtual boundary requirements",
subject = "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
\\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations \\ F.2.2
Theory of Computation, ANALYSIS OF ALGORITHMS AND
PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Geometrical problems and computations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous",
thesaurus = "Boundary-value problems; Design engineering;
Modelling",
treatment = "P Practical",
}
@Article{Srinivasan:1989:GTI,
author = "Vijay Srinivasan and Rangarajan Jayaraman",
title = "Geometric tolerancing. {II}. {Conditional}
tolerances",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "105--124",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68U05",
MRnumber = "993 627",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In a companion paper we examined the representation of
geometric tolerances in solid models from the
perspective of certain functional requirements. We
showed that assembly and material bulk requirements can
be specified as virtual boundary requirements (VBRs).
Here, we study the related issue of deriving equivalent
alternative specifications. Specifically, we first
explore the reasons for converting VBRs to another form
of tolerances designated as conditional tolerances
(CTs). We then develop a theoretical basis for
converting VBRs to CTs and derive CTs for some common
and practical VBRs. We thereby demonstrate the
difficulties in finding a general-purpose algorithm for
such conversions and also show that some of the CT
formulas used in current practice are incorrect.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170C (Project and design engineering)",
classification = "601; 921; 922; B0170C (Project and design
engineering)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Assembly; boundary-value problems; Conditional
tolerances; Conditional Tolerances; conditional
tolerances; design; design engineering; General Purpose
Algorithm; General-purpose algorithm; general-purpose
algorithm; Geometric Tolerancing; Mathematical Models;
Mathematical Statistics; Mathematical
Techniques--Algorithms; modelling; Position
Tolerancing; Product Design; Statistical Tolerancing;
theory; VBRs; verification; Virtual Boundary
Requirements",
subject = "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
\\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations \\ F.2.2
Theory of Computation, ANALYSIS OF ALGORITHMS AND
PROBLEM COMPLEXITY, Nonnumerical Algorithms and
Problems, Geometrical problems and computations \\
G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous",
thesaurus = "Boundary-value problems; Design engineering;
Modelling",
treatment = "P Practical",
}
@Article{RadicatidiBrozolo:1989:CGS,
author = "Giuseppe {Radicati di Brozolo} and Marcello
Vitaletti",
title = "Conjugate-gradient subroutines for the {IBM 3090}
{Vector Facility}",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "125--135",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper describes a set of optimized subroutines
for use in solving sparse, symmetric, positive definite
linear systems of equations using iterative algorithms.
The set has been included in the Engineering and
Scientific Subroutine Library (ESSL) for the IBM 3090
Vector Facility (VF). The subroutines are based on the
conjugate-gradient method, preconditioned by the
diagonal or by an incomplete factorization. They make
use of storage representations of sparse matrices that
are optimal for vector implementation. The ESSL vector
subroutines are up to six times faster than a scalar
implementation of the same algorithm.",
acknowledgement = ack-nhfb,
affiliation = "Eur. Center for Sci. and Eng. Comput., IBM Italy,
Rome, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4140 (Linear algebra); C7310 (Mathematics)",
classification = "723; 921; C4140 (Linear algebra); C7310
(Mathematics)",
corpsource = "Eur. Center for Sci. and Eng. Comput., IBM Italy,
Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Codes, Symbolic; Computer Programming;
Computer Programming languages--fortran;
Conjugate-gradient method; conjugate-gradient method;
Conjugate-Gradient Subroutines; definite linear
systems; design; Engineering and Scientific Subroutine
Library (ESSL); ESSL; fortran Codes; IBM 3090 Vector
Facility; IBM 3090 Vector Facility (VF); Incomplete
factorization; incomplete factorization; Iterative
algorithms; Iterative Algorithms; iterative algorithms;
iterative methods; Mathematical Techniques--Iterative
Methods; matrix algebra; measurement; Optimized
subroutines; optimized subroutines; parallel
algorithms; performance, IBM 3090 Vector Facility;
positive; Positive definite linear systems;
representations; Sparse matrices; sparse matrices;
storage; Storage representations; Subroutines;
subroutines; Vector implementation; vector
implementation",
subject = "G.1.3 Mathematics of Computing, NUMERICAL ANALYSIS,
Numerical Linear Algebra, Linear systems (direct and
iterative methods) \\ G.4 Mathematics of Computing,
MATHEMATICAL SOFTWARE \\ G.1.6 Mathematics of
Computing, NUMERICAL ANALYSIS, Optimization, Gradient
methods",
thesaurus = "Iterative methods; Matrix algebra; Parallel
algorithms; Subroutines",
treatment = "T Theoretical or Mathematical",
}
@Article{Succi:1989:LHI,
author = "Sauro Succi and Dominique d'Humieres and Ferenc
Szelenyi",
title = "Lattice-gas hydrodynamics on the {IBM 3090} vector
facility",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "136--148",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "After a brief review of the means for characterizing
lattice gases using cellular automata rules, the
authors discuss the implementation of the rules for
simulating hydrodynamic phenomena which can be
described by the Navier--Stokes equations. Special
emphasis is placed on data-mapping strategies and
implementation through the use of the high speed and
large memory resources offered by vector
multiprocessors such as the IBM 3090 Vector Facility.
Performance data pertain to square and hexagonal
lattice gases. The limits of the approach used and its
potential extendability to other areas are discussed.",
acknowledgement = ack-nhfb,
affiliation = "Eur. Center for Sci. and Eng. Comput., IBM Italy",
affiliationaddress = "Rome, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "A4710 (General theory, simulation and other
computational methods); A0550 (Lattice theory and
statistics; Ising problems); C7320 (Physics and
Chemistry)",
classification = "631; 722; 723; 921; 931; A0550 (Lattice theory and
statistics; A4710 (General theory, simulation and other
computational methods); C7320 (Physics and Chemistry);
Ising problems)",
corpsource = "Eur. Center for Sci. and Eng. Comput., IBM Italy,
Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "cellular automata; Cellular automata rules; Cellular
Automata Rules; Computer Aided Analysis; Computer
Systems, Digital--Multiprocessing; Data Mapping
Strategies; Data Processing; data-; Data-mapping
strategies; design; finite automata; Gases;
hydrodynamic phenomena; Hydrodynamic phenomena;
hydrodynamics; Hydrodynamics; IBM 3090 Vector Facility;
lattice gases; Lattice gases; lattice theory and;
Lattice-Gas Hydrodynamics; mapping strategies;
measurement; Memory resources; memory resources; Navier
Stokes Equations; Navier--Stokes equations;
performance, IBM 3090 Vector Facility; physics
computing; rules; statistics; Vector Multiprocessor;
Vector multiprocessors; vector multiprocessors",
subject = "F.1.1 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Models of Computation, Unbounded-action
devices \\ G.2.m Mathematics of Computing, DISCRETE
MATHEMATICS, Miscellaneous \\ G.1.m Mathematics of
Computing, NUMERICAL ANALYSIS, Miscellaneous \\ J.2
Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Physics",
thesaurus = "Finite automata; Hydrodynamics; Lattice theory and
statistics; Navier--Stokes equations; Physics
computing",
treatment = "T Theoretical or Mathematical",
}
@Article{Waicukauski:1989:MGW,
author = "John A. Waicukauski and Eric Lindbloom and Edward B.
Eichelberger and Orazio P. Forlenza",
title = "A method for generating weighted random test
patterns",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "149--161",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A new method for generating weighted random patterns
for testing LSSD logic chips and modules is described.
Advantages in using weighted random versus either
deterministic or random test patterns are discussed. An
algorithm for calculating an initial set of
input-weighting factors and a procedure for obtaining
complete stuck-fault coverage are presented.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Gen. Technol., IBM Corp.",
affiliationaddress = "Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5210 (Logic design methods);
C5120 (Logic and switching circuits)",
classification = "713; 714; 721; 723; 922; B1265B (Logic circuits);
C5120 (Logic and switching circuits); C5210 (Logic
design methods)",
corpsource = "Div. of Gen. Technol., IBM Corp., Hopewell Junction,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Computer Programming--Algorithms; design; Initial
Weight Generation; Input Weighting Factors;
Input-weighting factors; input-weighting factors;
Integrated Circuit Testing; Integrated Circuits,
VLSI-testing; integrated logic circuits; Logic Devices;
logic testing; LSSD Logic Chips; LSSD logic chips;
measurement; modules; Modules; performance;
reliability; Stuck Fault Coverage; Stuck-fault
coverage; stuck-fault coverage; Testing; verification,
Weighted random test patterns; Weighted Random Test
Patterns; weighted random test patterns",
subject = "B.7.3 Hardware, INTEGRATED CIRCUITS, Reliability and
Testing, Test generation \\ B.7.1 Hardware, INTEGRATED
CIRCUITS, Types and Design Styles, Advanced
technologies \\ C.4 Computer Systems Organization,
PERFORMANCE OF SYSTEMS",
thesaurus = "Integrated logic circuits; Logic testing",
treatment = "P Practical",
}
@Article{Stapper:1989:LFC,
author = "Charles H. Stapper",
title = "Large-area fault clusters and fault tolerance in
{VLSI} circuits: a review",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "162--173",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Fault-tolerance techniques and redundant circuits have
been used extensively to increase the manufacturing
yield and productivity of integrated-circuit chips.
Presented here is a review of relevant statistical
models which have been used to account for the effects
on manufacturing yield of the large-area defect and
fault clusters commonly encountered during chip
fabrication. A statistical criterion is described for
determining whether such large-area clusters are
present.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Gen. Technol., IBM Corp.",
affiliationaddress = "Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits)",
classification = "713; 714; 921; 922; B2570 (Semiconductor integrated
circuits)",
corpsource = "Div. of Gen. Technol., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Chip fabrication; chip fabrication; Cluster Parameter
Dependencies; experimentation; fault clusters; Fault
clusters; fault location; fault tolerance; Fault
Tolerance; Fault tolerance; integrated circuit testing;
Integrated Circuits, VLSI; Integrated-circuit chips;
integrated-circuit chips; Large-Area Fault Clusters;
manufacturing yield; Manufacturing yield; Mathematical
Models; Mathematical Statistics--Applications;
measurement; performance; productivity; Productivity;
Redundancy; redundancy; redundant circuits; Redundant
circuits; reliability; statistical criterion;
Statistical criterion, design; Statistical models;
Statistical Models; statistical models; verification;
VLSI; VLSI circuits",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ B.7.3
Hardware, INTEGRATED CIRCUITS, Reliability and Testing
\\ C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS",
thesaurus = "Fault location; Integrated circuit testing;
Redundancy; VLSI",
treatment = "P Practical",
}
@Article{Stapper:1989:SFC,
author = "Charles H. Stapper",
title = "Small-area fault clusters and fault tolerance in
{VLSI} circuits",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "174--177",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In previous treatments of the manufacturing yield of
fault-tolerant integrated-circuit chips, fault clusters
were either assumed to be absent or relatively large in
area. Presented here is a treatment in which the
occurrence of small-area fault clusters is assumed.
Four different types of statistical distributions are
considered, and a criterion is described for
determining whether small-area fault clusters are
present.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Gen. Technol., IBM Corp.",
affiliationaddress = "Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits)",
classification = "713; 714; 921; 922; B2570 (Semiconductor integrated
circuits)",
corpsource = "Div. of Gen. Technol., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "area fault clusters; design; experimentation; fault
clusters; Fault clusters; fault location; Fault
Tolerance; fault tolerance; fault-; Fault-tolerant
integrated-circuit chips; integrated circuit testing;
Integrated Circuits, VLSI; manufacturing yield;
Manufacturing yield; Mathematical Models; Mathematical
Statistics; measurement; Negative Binomial Model;
performance; reliability; small-; Small-Area Fault
Clusters; Small-area fault clusters; Statistical
distributions; statistical distributions; Statistical
Models; tolerant integrated-circuit chips;
verification, Fault tolerance; VLSI; VLSI circuits",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, VLSI (very large scale integration) \\ B.7.3
Hardware, INTEGRATED CIRCUITS, Reliability and Testing
\\ C.4 Computer Systems Organization, PERFORMANCE OF
SYSTEMS \\ G.3 Mathematics of Computing, PROBABILITY
AND STATISTICS, Statistical computing",
thesaurus = "Fault location; Integrated circuit testing; VLSI",
treatment = "P Practical",
}
@Article{Molteni:1989:TOS,
author = "William J. {Molteni, Jr.} and David Small",
title = "Translating object specifications into a
computer-generated three-dimensional graphic to be
reproduced as a high efficiency, reflection
photo-polymer hologram suitable for mass-production",
journal = j-IBM-JRD,
volume = "33",
number = "2",
pages = "178--181",
month = mar,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A process is described for translating the
specifications of an object and its interrelationship
with another object into a three-dimensional computer
graphic and then into a photo-polymer hologram. The
capability to translate specifications about objects
and their interrelationships into accurate holograms
without having to create either a physical model or the
manufactured object itself opens exciting possibilities
in the areas of creative design and communication. It
may assist in the manufacturing process by allowing
designers to specify objects and to study accurate,
three-dimensional representations of those
specifications, including interrelationships with other
objects, without the need for an actual physical model.
Finally, the hologram may become a means for effective
representation of an image produced through the use of
three-dimensional computer graphics for people without
access to appropriate computer graphics.",
abstract-2 = "The capability to translate specifications about
objects and their interrelationships into accurate
holograms without having to create either a physical
model or the manufactured object itself opens exciting
possibilities in the areas of creative design and
communication. It may assist in the manufacturing
process by allowing designers to specify objects and to
study accurate, three-dimensional representations of
those specifications, including interrelationships with
other objects, without the need for an actual physical
model. Finally, the hologram may become a means for
effective representation of an image produced through
the use of three-dimensional computer graphics for
people without access to appropriate computer graphics.
The process described here was divided into two
segments. The MIT Media Lab was responsible for
creating a sequence of computer-generated images and
transferring those images to film. Polaroid Corporation
was responsible for creating the hologram from the
images on film.",
acknowledgement = ack-nhfb,
affiliation = "Polaroid Corp.",
affiliationaddress = "Cambridge, MA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B4350 (Holography); C5260B (Computer vision and
picture processing)",
classification = "723; 743; B4350 (Holography); C5260B (Computer
vision and picture processing)",
corpsource = "Polaroid Corp., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accurate; Accurate holograms; computer graphics;
Computer Graphics; computer-generated holography;
Computer-generated images; computer-generated images;
computer-generated three-dimensional;
Computer-generated three-dimensional graphic; Creative
Design; creative design; Creative design; design,
Object specifications; graphic; Holograms; holograms;
MIT Media Lab; object specifications; Object
Specifications; Photo-Polymer Hologram; physical model;
Physical model; Polaroid Corporation; reflection
photo-polymer hologram; Reflection photo-polymer
hologram; Three Dimensional Graphics",
subject = "I.3.7 Computing Methodologies, COMPUTER GRAPHICS,
Three-Dimensional Graphics and Realism \\ J.6 Computer
Applications, COMPUTER-AIDED ENGINEERING",
thesaurus = "Computer graphics; Computer-generated holography",
treatment = "A Application; P Practical",
}
@Article{Kitazawa:1989:CUE,
author = "Koichi Kitazawa",
title = "Current understanding of electronic structure and some
difficulties with cuprate semiconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "201--207",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Experimental observations of the high-T$_c$ cuprate
superconductors are reviewed from the perspective of
electronic structures. On the basis of
Mott-Hubbard-type band splitting, the semiconductivity,
antiferromagnetism, and metallic nature of the cuprate
oxides are discussed as a function of the dopant
concentration. Then the involvement of the O 2p band
which falls between the lower and upper Hubbard bands,
as determined by electron spectroscopy, is discussed.
The complex nature of the Fermi surface is considered,
and the importance of the involvement of both the O 2p
and the lower Hubbard band is stressed.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Ind. Chem.",
affiliationaddress = "Tokyo, Jpn",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/ss O/ss",
classcodes = "A7125T (Band structure of crystalline semiconductor
compounds and insulators); A7470V (Perovskite phase
superconductors); A7125H (Measurement of Fermi surface
parameters); A7550E (Antiferromagnetics)",
classification = "701; 712; 804; 933; A7125H (Measurement of Fermi
surface parameters); A7125T (Band structure of
crystalline semiconductor compounds and insulators);
A7470V (Perovskite phase superconductors); A7550E
(Antiferromagnetics)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Dept. of Ind. Chem., Tokyo Univ., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "antiferromagnetic properties of substances;
Antiferromagnetism; antiferromagnetism; Band Splitting;
band structure; Copper Oxide--Doping; cuprate; Cuprate
Oxides; Cuprate oxides; cuprate semiconductors; Cuprate
Semiconductors; Cuprate semiconductors; Cuprate
superconductors; cuprate superconductors; design, High
temperature superconductors; Dopant Concentration;
Dopant concentration; dopant concentration; electron;
Electron spectroscopy; Electronic Properties;
Electronic structures; electronic structures;
experimentation; Fermi surface; Fermi Surface; Fermi
surface; high temperature superconductors;
high-temperature superconductors; Hubbard bands;
Hubbard Bands; Hubbard model; measurement; metallic;
Metallic; Mott-Hubbard-; Mott-Hubbard-type band
splitting; of crystalline semiconductors and
insulators; oxides; performance; Semiconductor
Materials; spectroscopy; superconducting
semiconductors; type band splitting",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Antiferromagnetic properties of substances; Band
structure of crystalline semiconductors and insulators;
Fermi surface; High-temperature superconductors;
Hubbard model; Superconducting semiconductors",
treatment = "T Theoretical or Mathematical",
}
@Article{Batlogg:1989:HSB,
author = "Bertram Batlogg and Robert J. Cava and Lynn F.
Schneemeyer and Gerald P. Espinosa",
title = "High-{T}$_c$ superconductivity in bismuthates --- How
many roads lead to high {T}$_c$?",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "208--214",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The superconducting transition temperature in
BaBiO$_3$-based superconductors exceeds 30 K. Magnetic
measurements are analyzed to give their density of
states at E$_F$, N*(0) varies as gamma. The uniqueness
of Bi-O and Cu-O superconductors is revealed in an
updated T$_c$- gamma plot. The two classes of compounds
share basic electronic properties, particularly a
partially unoccupied band with significant O 2p
character, which might favor a common pairing
mechanism.",
acknowledgement = ack-nhfb,
affiliation = "AT and T Bell Labs.",
affiliationaddress = "Murray Hill, NJ, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "BaBiO3/ss Ba/ss Bi/ss O3/ss O/ss",
classcodes = "A7410 (Occurrence, critical temperature); A7470V
(Perovskite phase superconductors); A7430C
(Magnetization curves, Meissner effect, penetration
depth)",
classification = "701; 708; 804; A7410 (Occurrence, critical
temperature); A7430C (Magnetization curves, Meissner
effect, penetration depth); A7470V (Perovskite phase
superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "AT and T Bell Labs., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "BaBiO$_3$; BaBiO/sub 3/; barium compounds; Bismuth
Compounds--Electric Conductivity; bismuthates;
Bismuthates; density; Density of states; design;
electronic density of states; electronic properties;
Electronic properties; high temperature
superconductors; High Temperature Superconductors; High
temperature superconductors; high-; magnetic
measurements; Magnetic measurements; magnetisation;
measurement; of states; pairing; Pairing; Pairing
Mechanism; performance; Physical Properties;
superconducting; Superconducting Materials;
superconducting transition temperature; Superconducting
Transition Temperature; Superconducting transition
temperature; Superconductivity; temperature
superconductors; transition temperature",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; Electronic density of states;
High-temperature superconductors; Magnetisation;
Superconducting transition temperature",
treatment = "X Experimental",
}
@Article{Varma:1989:IRC,
author = "Chaudhra M. Varma",
title = "Interim report on the charge-transfer resonance model
for the {Cu-O} superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "215--219",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The two-band model including intra-atomic repulsion on
Cu and near-neighbor Cu-O repulsion for the high
temperature superconductors is supported by experiments
and theoretical calculations as the minimum necessary.
The specific mechanism for high T$_c$ through
charge-transfer resonances was proposed because the
known alternative mechanisms --- phonons and magnetic
excitations --- were believed unlikely. The case for
charge-transfer-resonance-induced high T$_c$ has,
however, not yet been proven. The various anomalies in
the metallic state are not yet understood. However,
calculations on the model do show a charge-transfer-gap
insulating state which is antiferromagnetic at and near
\$HLF filling, a metallic state for intermediate
filling with effective particle-particle attraction,
and a charge-transfer instability beyond a certain
filling.",
acknowledgement = ack-nhfb,
affiliation = "AT and T Bell Labs.",
affiliationaddress = "Murray Hill, NJ, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/ss O/ss",
classcodes = "A7420 (Theory); A7470V (Perovskite phase
superconductors)",
classification = "701; 708; 804; 933; A7420 (Theory); A7470V
(Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "AT and T Bell Labs., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Antiferromagnetic; antiferromagnetic; band model;
Charge-Transfer Resonance; charge-transfer resonance
model; Copper Compounds--Electric Conductivity; Cu-O
superconductors; design, Charge-transfer resonance
model; experimentation; High Temperature
Superconductors; high-temperature; high-temperature
superconductors; High-temperature superconductors;
Instability; instability; Insulating state; insulating
state; Intra-atomic repulsion; intra-atomic repulsion;
Intra-Atomic Repulsion; Mathematical Models; metallic
state; Metallic state; Particle-Particle Attraction;
Superconducting Materials; superconductors; two-;
Two-band model",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "High-temperature superconductors",
treatment = "T Theoretical or Mathematical",
}
@Article{Hewat:1989:ODS,
author = "Alan W. Hewat and Elizabeth A. Hewat and Pierre Bordet
and Jean-Jacques Capponi and Catherine Chaillout and
Jean Chenavas and Jean-Louis Hodeau and Massimo Marezio
and Pierre Strobel and Michel Fran{\c{c}}ois and Klaus
Yvon and Peter Fischer and J.-L. Tholence",
title = "Oxygen ``disorder'' and the structures of high-{T}$_c$
superconductors by neutron powder diffraction",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "220--227",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "All of the high-T$_c$ perovskite superconductors
appear to show disorder of certain oxygen atoms. In
(La,Sr)$_2$CuO$_4$ and perhaps also in YBa/sub
2/Cu$_3$O$_7$ this is associated with a structural
transition. The Bi and Tl superconductors, for which
the authors now have neutron structural data on four
different phases, also show oxygen `disorder' which may
be associated with valence fluctuations. In
Tl$_2$Ba$_2$CuO$_6$, electron holes are created by the
absence of 1/8 of the atoms in the TlO plane, producing
a marked superstructure. However, this material is not
superconducting if the superstructure is well ordered,
with an orthorhombic (strictly monoclinic) structure.
The T$_c$ appears to depend on the disorder of the
superstructure to produce a pseudotetragonal metric in
which the oxygen atoms within the TlO plane are
distributed over four equivalent sites about the center
of the Tl square.",
acknowledgement = ack-nhfb,
affiliation = "Inst. Max von Laue-Paul Langevin, Grenoble, France",
affiliationaddress = "Grenoble, Fr",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "BiCaSrCuO/ss Bi/ss Ca/ss Cu/ss Sr/ss O/ss;
TlCaBaCuO/ss Ba/ss Ca/ss Cu/ss Tl/ss O/ss; LaSrCuO4/ss
Cu/ss La/ss O4/ss Sr/ss O/ss; YBa2Cu3O7/ss Ba2/ss
Cu3/ss Ba/ss Cu/ss O7/ss O/ss Y/ss; Tl2Ba2CuO6/ss
Ba2/ss Tl2/ss Ba/ss Cu/ss O6/ss Tl/ss O/ss",
classcodes = "A6160 (Specific structure of inorganic compounds);
A7470V (Perovskite phase superconductors)",
classification = "701; 708; 804; 932; A6160 (Specific structure of
inorganic compounds); A7470V (Perovskite phase
superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Inst. Max von Laue-Paul Langevin, Grenoble, France",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(LaSr)$_2$CuO$_4$; (LaSr)$_2$CuO/sub 4/; BiCaSrCuO;
crystal atomic structure of inorganic compounds;
design, High temperature superconductors; diffraction;
disorder; Disorder; high temperature superconductors;
High Temperature Superconductors; high-; measurement;
neutron diffraction examination; neutron powder;
Neutron powder diffraction; Neutron Powder Diffraction;
Neutrons--Diffraction; of materials; performance;
perovskite superconductors; Perovskite superconductors;
Perovskite Superconductors; Powders; Pseudotetragonal
Metric; structural; Structural transition; Structure;
structures; Structures; Superconducting Materials;
superstructure; Superstructure; temperature
superconductors; Tl$_2$Ba$_2$CuO$_6$;
Tl$_2$Ba$_2$CuO/sub 6/; TlCaBaCuO; transition; valence
fluctuations; Valence fluctuations; YBa$_2$Cu$_3$O$_7$;
YBa/sub 2/Cu/sub 3/O/sub 7/",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Crystal atomic structure of inorganic compounds;
High-temperature superconductors; Neutron diffraction
examination of materials",
treatment = "X Experimental",
}
@Article{Beyers:1989:TSO,
author = "Robert B. Beyers and Stuart S. P. Parkin and Victor Y.
Lee and Adel L. Nazzal and Richard J. Savoy and G. L.
Gorman and T. C. Huang and S. J. {La Placa}",
title = "{Tl-Ca-Ba-Cu-O} superconducting oxides",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "228--237",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper reviews structural studies of Tl-Ca-Ba-Cu-O
superconducting oxides by the authors and others and
points out directions for future work.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Centre",
affiliationaddress = "San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "TlCaBaCuO/ss Ba/ss Ca/ss Cu/ss Tl/ss O/ss",
classcodes = "A6160 (Specific structure of inorganic compounds);
A7470V (Perovskite phase superconductors)",
classification = "701; 708; 804; 933; A6160 (Specific structure of
inorganic compounds); A7470V (Perovskite phase
superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Almaden Res. Centre, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "barium compounds; calcium compounds; Copper
Oxide--Electric Conductivity; crystal atomic; High
temperature superconductors; high temperature
superconductors; high-temperature; Layered Copper
Oxides; Oxides; Structural studies; structural studies;
Structure; structure of inorganic compounds;
Superconducting Materials; Superconducting Oxides;
superconducting oxides; Superconducting oxides;
superconductors; thallium compounds; Thallium
Compounds--Electric Conductivity; Tl-Ca-Ba-Cu-O",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; Calcium compounds; Crystal atomic
structure of inorganic compounds; High-temperature
superconductors; Thallium compounds",
treatment = "X Experimental",
}
@Article{Collins:1989:ISN,
author = "Reuben T. Collins and Zack Schlesinger and Frederic H.
Holtzberg and Praveen Chaudhari and Christopher A.
Feild",
title = "Infrared studies of the normal and superconducting
states of {Y}$_1$Ba$_2$Cu$_3${O}$_7$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "238--245",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We describe infrared measurements of the a-b-plane
response of Y$_1$Ba$_2$Cu$_3$O$_7$ crystals with T$_c$
\$APEQ 92 K. We observe a self-energy structure at a
characteristic energy of 500 cm\$+\$MIN@1\$/ (8kT$_c$),
the appearance of which coincides with the transition
to the superconducting state. The nature of this
self-energy anomaly is consistent with its
identification as a nodeless a-b-plane energy gap at
2\$Delta \$APEQ 8kT$_c$. On the basis of
temperature-dependent measurements above T$_c$, we
suggest that the normal state can be primarily
characterized by a carrier band with an enhanced
low-frequency mass and a frequency-dependent scattering
rate. Our data indicate that these arise from coupling
to an excitation spectrum with characteristic
frequencies up to \$omega$_c$ approximately 700
cm\$+\$MIN@1\$/ and a coupling strength of \$lambda
\$APEQ 2-3.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Y1Ba2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss Y1/ss
O/ss Y/ss",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7470V
(Perovskite phase superconductors); A7830G (Infrared
and Raman spectra in inorganic crystals)",
classification = "701; 708; 741; 804; 812; 933; A7430G (Response to
electromagnetic fields, nuclear magnetic resonance,
ultrasonic attenuation); A7470V (Perovskite phase
superconductors); A7830G (Infrared and Raman spectra in
inorganic crystals)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Height, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "92 K; barium compounds; Ceramic Materials; coupling;
Coupling strength; design; Energy gap; energy gap;
Excitation spectrum; excitation spectrum; High
temperature superconductor; high temperature
superconductor; High Temperature Superconductors;
high-temperature superconductors; infrared; Infrared
Measurements; infrared measurements; Infrared
measurements; Infrared Radiation; mass; Mass;
measurement; normal; Normal state; Normal State;
Oxides; performance; Physical Properties; scattering
rate; Scattering rate; self-energy; Self-energy;
Self-Energy Anomaly; spectra of inorganic solids;
state; strength; superconducting energy gap;
Superconducting Materials; superconducting states;
Superconducting States; Superconducting states;
Y$_1$Ba$_2$Cu$_3$O$_7$, experimentation; Y/sub
1/Ba$_2$Cu/sub 3/O/sub 7/; Yttrium Barium Copper Oxide;
yttrium compounds; Yttrium Compounds--Electric
Conductivity",
numericalindex = "Temperature 9.2E+01 K",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; High-temperature superconductors;
Infrared spectra of inorganic solids; Superconducting
energy gap; Yttrium compounds",
treatment = "X Experimental",
}
@Article{Emery:1989:NHS,
author = "Victor J. Emery",
title = "On the nature of high-temperature superconductivity",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "246--251",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A picture of the electronic structure, magnetism, and
superconductivity in high-T$_c$ oxides is obtained from
a simple analysis of experiments and models of the
copper oxide planes. It is shown that magnetism is
associated with holes on copper and superconductivity
with holes on oxygen. The pairing force is not
retarded. Questions about the motion of charges in an
antiferromagnetic background and the many-body theory
of high-temperature superconductivity are discussed.
Differences between the cuprates and doped BaBiO$_3$
are emphasized.",
acknowledgement = ack-nhfb,
affiliation = "Brookhaven Nat. Lab.",
affiliationaddress = "Upton, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/ss O/ss; BaBiO3/ss Ba/ss Bi/ss O3/ss O/ss",
classcodes = "A7420 (Theory); A7470V (Perovskite phase
superconductors)",
classification = "701; 708; 804; 933; A7420 (Theory); A7470V
(Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Brookhaven Nat. Lab., Upton, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Antiferromagnetic; antiferromagnetic;
antiferromagnetic properties of substances; band
structure; Barium Compounds--Electric Conductivity;
body theory; Cuprates; cuprates; design,
High-temperature superconductivity; Doped BaBiO$_3$;
doped BaBiO/sub 3/; Electronic Properties; Electronic
structure; electronic structure; high-;
High-Temperature; high-temperature superconductivity;
Magnetism; magnetism; many-; Many-body theory;
Many-Body Theory; of crystalline semiconductors and
insulators; Oxides; oxides; pairing force; Pairing
Force; Pairing force; performance; Superconductivity;
temperature superconductors",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Antiferromagnetic properties of substances; Band
structure of crystalline semiconductors and insulators;
High-temperature superconductors",
treatment = "T Theoretical or Mathematical",
}
@Article{Kapitulnik:1989:MTH,
author = "Aharon Kapitulnik and Kookrin Char",
title = "Measurements on thin-film high-{T}$_c$
superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "252--261",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We report on the fabrication and properties of
high-T$_c$ superconducting films, and discuss the
possible origin of the linear resistivity. We discuss
the c-axis conductivity and present data to show that
the coherence length is 12 Angstrom parallel to the
plane and 2 Angstrom perpendicular to the plane in the
superconducting state. Tunneling data show that the
energy gap is large.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Appl. Phys.",
affiliationaddress = "Stanford, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7475 (Superconducting films); A7470V (Perovskite
phase superconductors); A7450 (Proximity effects,
tunnelling phenomena, and Josephson effect)",
classification = "539; 701; 708; 804; 812; 942; A7450 (Proximity
effects, tunnelling phenomena, and Josephson effect);
A7470V (Perovskite phase superconductors); A7475
(Superconducting films)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Dept. of Appl. Phys., Stanford Univ., CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Anisotropy; anisotropy; C-Axis Conductivity; Ceramic
Materials; coherence; coherence length; Coherence
Length; Coherence length; conductivity; Conductivity;
design, High temperature superconductors; Electric
Measurements; Energy Gap; Fabrication; fabrication;
High Temperature Superconductors; high temperature
superconductors; high-temperature superconductors;
length; Linear Resistivity; measurement; Oxides;
performance; resistivity; Resistivity; Superconducting
Materials; superconducting thin films; superconductive
tunnelling; Thin Films; thin-film; Thin-film;
tunneling; Tunneling; Yttrium Barium Copper Oxide",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Coherence length; High-temperature superconductors;
Superconducting thin films; Superconductive
tunnelling",
treatment = "X Experimental",
}
@Article{Gough:1989:GJQ,
author = "C. E. Gough",
title = "Granular {Josephson} and quantum interference effects
in {HTC} ceramic superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "262--269",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Josephson effects in high-T$_c$ superconductors are
briefly reviewed, with specific reference to granular
ceramic materials and SQUID device applications. It is
suggested that the inductance associated with
intergranular current loops may play an important role,
even in determining the bulk superconductivity
properties, as in weak-link superconducting rings.
Evidence for quantum interference effects within
intergranular current loops is presented. In ultra-low
fields, the observed temperature dependence of
thermally activated flux creep cannot be described by a
simple granular superconductor model of equally spaced
pinning centers, but would seem to imply a hierarchy of
pinning sites of variable strength. The development of
liquid-nitrogen-cooled RF and DC SQUIDs is described,
and the noise levels currently achieved are
presented.",
acknowledgement = ack-nhfb,
affiliation = "Supercond. Res. Group, Birmingham Univ., UK",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7450 (Proximity effects, tunnelling phenomena, and
Josephson effect); A7470V (Perovskite phase
superconductors); A7460G (Flux pinning, flux motion,
fluxon-defect interactions); A7470M (Amorphous, highly
disordered, and granular superconductors)",
classification = "701; 704; 708; 741; 804; 812; 933; A7450 (Proximity
effects, tunnelling phenomena, and Josephson effect);
A7460G (Flux pinning, flux motion, fluxon-defect
interactions); A7470M (Amorphous, highly disordered,
and granular superconductors); A7470V (Perovskite phase
superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Supercond. Res. Group, Birmingham Univ., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Bulk Superconductivity; Ceramic Materials; ceramic
superconductors; Ceramic superconductors; design, High
temperature superconductors; Electric Conductivity;
electron device noise; flux creep; Flux creep; flux
pinning; granular ceramic materials; Granular Ceramic
Materials; Granular ceramic materials; Granular
Materials; granular superconductor; Granular
superconductor; High Temperature Superconductivity;
high temperature superconductors; High Temperature
Superconductors; high-; inductance; Inductance;
Infrared Measurements; intergranular current loops;
Intergranular current loops; Josephson effect;
Josephson effects; Josephson Effects; Josephson
effects; measurement; noise; Noise; Normal State;
performance; pinning; Pinning; quantum interference;
Quantum interference; Quantum Interference Effects;
Self-Energy Anomaly; SQUID; squid Device; SQUIDs;
Superconducting Devices--Josephson Junctions;
Superconducting Materials; superconducting rings;
Superconducting States; temperature superconductors;
weak-link; Weak-link superconducting rings; Yttrium
Barium Copper Oxide",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Electron device noise; Flux creep; Flux pinning;
High-temperature superconductors; Josephson effect;
SQUIDs",
treatment = "T Theoretical or Mathematical",
}
@Article{Birgeneau:1989:QEI,
author = "Robert T. Birgeneau and Yasuo Endoh and Y. Hidaka and
Kazuhisa Kakurai and Marc A. Kastner and T. Murakami
and Gen Shirane and Thomas R. Thurston and Kazuyoshi
Yamada",
title = "Quasi-elastic and inelastic neutron-scattering studies
of superconducting {La}$_{2-x}${Sr}$_x$/{CuO}$_4$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "270--276 (or 270--275??)",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We review the results of recent neutron-scattering
studies of the spin fluctuations in samples of
La$_{1.89}$Sr$_{0.11}$CuO$_4$ which are approximately
80\% superconducting with T$_c$ $=$ 10 K. The structure
factor, S(Q), reflects three-dimensional modulated spin
correlations with an in-plane correlation length of
order 18 \$POM 6 Angstrom. The fluctuations evolve with
temperature from being predominantly dynamic at high
temperatures to mainly quasi-elastic
(\$VBAR\$Delta@E\$VBAR \$LS 0.5 meV) at low
temperatures. No significant differences are observed
in the normal and superconducting states.",
acknowledgement = ack-nhfb,
affiliation = "MIT",
affiliationaddress = "Cambridge, MA, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "La1.89Sr0.11CuO4/ss La1.89/ss Sr0.11/ss Cu/ss La/ss
O4/ss Sr/ss O/ss",
classcodes = "A7525 (Spin arrangements in magnetically ordered
materials); A7470V (Perovskite phase superconductors);
A7540G (Dynamic properties)",
classification = "701; 708; 804; 932; A7470V (Perovskite phase
superconductors); A7525 (Spin arrangements in
magnetically ordered materials); A7540G (Dynamic
properties)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "MIT, Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "1.89/Sr/sub 0.11/CuO/sub 4/; 10 K; High temperature
superconductor; high temperature superconductor;
high-temperature superconductors; Inelastic
neutron-scattering; inelastic neutron-scattering;
La$_{1.89}$Sr$_{0.11}$CuO$_4$; La/sub; lanthanum
compounds; Lanthanum Compounds--Electric Conductivity;
Modulated Spin Correlations; neutron diffraction
examination of materials; Neutrons--Scattering;
Physical Properties; quasielastic neutron; Quasielastic
neutron scattering; scattering; spin correlations; Spin
correlations; spin dynamics; Spin Fluctuations; spin
fluctuations; Spin fluctuations; strontium compounds;
Structure factor; structure factor; Superconducting
Materials; Superconducting States",
numericalindex = "Temperature 1.0E+01 K",
thesaurus = "High-temperature superconductors; Lanthanum compounds;
Neutron diffraction examination of materials; Spin
dynamics; Strontium compounds",
treatment = "X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
xxnote = "Check page numbers: conflict with
\cite{Endoch:1989:QIN}.",
}
@Article{Endoch:1989:QIN,
author = "Yasuo Endoch and Y. Hidaka and Kazuhisa Kakurai and
Marc A. Kastner and T. Murakami",
title = "Quasi-elastic and inelastic neutron-scattering studies
of superconducting La$_{2-x}${Sr}$_x${CuO}$_4$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "270--276",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun May 02 08:07:07 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Deutscher:1989:SS}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; experimentation; measurement; performance",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
xxnote = "Check page numbers: conflict with
\cite{Birgeneau:1989:QEI}.",
}
@Article{Kitaoka:1989:NSM,
author = "Y. Kitaoka and K. Ishida and K. Fujiwara and K.
Asayama and H. Yoshida Katayama and Y. Okabe and T.
Takahashi",
title = "{NMR} study of magnetism and superconductivity in
high-{T}$_c$ oxides",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "277--285",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The results of $^{139}$La and $^{63}$Cu nuclear
quadrupole resonance (NQR) on La-Ba, Sr-Cu-O,
Y-Ba-Cu-O, and Bi-Pb-Sr-Ca-Cu-O compounds and of
$^{17}$O nuclear magnetic resonance (NMR) on Y-Ba-Cu-O
are reviewed. As for the magnetism, the phase diagram
for the La system studied by a $^{139}$La NQR
experiment is presented, with evidence of the
disordered magnetic state between the
3D-antiferromagnetic (AF) ordered state and the
superconducting state. With respect to its
superconducting nature, the nuclear spin-lattice
relaxation behavior (T$_1$) of Cu in the CuO$_2$ plane
has been found to be unconventional above and below
T$_c$ for all compounds, with no signatures expected
for a nonmagnetic metal and a BCS superconductor,
respectively. The behavior of T$_1$ of Cu above T$_c$
is shown to be dominated by AF fluctuation of Cu d
spins. In contrast, an enhancement of 1/T$_1$ of
$^{17}$O has been observed just below T$_c$, which is
similar to a BCS case.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Mater. Phys., Osaka Univ.",
affiliationaddress = "Toyonaka, Jpn",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "LaBaSrCuO/ss Ba/ss Cu/ss La/ss Sr/ss O/ss;
BiPbSrCaCuO/ss Bi/ss Ca/ss Cu/ss Pb/ss Sr/ss O/ss;
YBaCuO/ss Ba/ss Cu/ss O/ss Y/ss",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7470V
(Perovskite phase superconductors); A7660E (Relaxation
effects); A7660G (Quadrupole resonance); A7550E
(Antiferromagnetics); A7430C (Magnetization curves,
Meissner effect, penetration depth); A7470H (Magnetic
superconductors); A7530K (Magnetic phase boundaries)",
classification = "701; 708; 804; 931; A7430C (Magnetization curves,
Meissner effect, penetration depth); A7430G (Response
to electromagnetic fields, nuclear magnetic resonance,
ultrasonic attenuation); A7470H (Magnetic
superconductors); A7470V (Perovskite phase
superconductors); A7530K (Magnetic phase boundaries);
A7550E (Antiferromagnetics); A7660E (Relaxation
effects); A7660G (Quadrupole resonance)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Dept. of Mater. Phys., Osaka Univ., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "/sup 139/La; /Sup 139/La; /sup 17/O; /Sup 17/O; /sup
63/Cu; /Sup 63/Cu; antiferromagnetic; Antiferromagnetic
fluctuations; antiferromagnetic properties of
substances; Ba-Cu-O; BCS superconductor;
Bi-Pb-Sr-Ca-Cu-O; design, High temperature
superconductors; disordered magnetic state; Disordered
Magnetic State; Disordered magnetic state;
fluctuations; High Temperature Superconductivity; high
temperature superconductors; high-temperature;
La-Ba-Sr-Cu-O; magnetic; Magnetic Properties; magnetic
superconductors; magnetism; Magnetism; measurement;
NMR; nonmagnetic metal; Nonmagnetic metal; Nonmagnetic
Metal; NQR; nuclear magnetic resonance; Nuclear
Magnetic Resonance; nuclear quadrupole; Nuclear
Quadrupole Resonance (NQR); nuclear spin-lattice
relaxation; Nuclear spin-lattice relaxation; oxides;
Oxides; performance; phase diagram; Phase diagram;
resonance; Spin-Lattice Relaxation; Superconducting
Materials; Superconducting State; superconductivity;
Superconductivity; superconductors; transitions; Y-;
Y-Ba-Cu-O",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Antiferromagnetic properties of substances;
High-temperature superconductors; Magnetic
superconductors; Magnetic transitions; Nuclear magnetic
resonance; Nuclear quadrupole resonance; Nuclear
spin-lattice relaxation",
treatment = "X Experimental",
xxauthor = "Y. Kitaoka and K. Ishida and K. Fujiwara and K.
Asayama and H. Katayama-Yoshida and Y. Okabe and T.
Takahashi",
xxnote = "Check authors??",
}
@Article{Aharony:1989:MFM,
author = "Amnon Aharony and Robert J. Birgeneau and Marc A.
Kastner",
title = "Magnetic frustration model and superconductivity in
doped planar {CuO}$_2$ systems",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "287--292",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We present a model for the magnetic phases and
superconductivity in doped planar CuO$_2$ systems.
Electronic holes on the oxygen ions introduce local
ferromagnetic exchange couplings between the Cu spins.
The resulting frustration destroys the
antiferromagnetic state characterizing the undoped
planes, and generates a new spin-glass phase. This
frustration also yields an attractive interaction
between the holes, whose range decreases with
increasing doping. We use the BCS approximation to
obtain an estimate of the superconducting transition
temperature T$_c$(x) for
La\$-2\$MINx\$/Sr$_x$CuO$_4$.",
acknowledgement = ack-nhfb,
affiliation = "Raymond and Beverley Sackler Fac. of Exact Sci.",
affiliationaddress = "Tel Aviv, Isr",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/ss O/ss; LaSrCuO4/ss Cu/ss La/ss O4/ss Sr/ss
O/ss",
classcodes = "A7420F (BCS theory and its applications); A7470V
(Perovskite phase superconductors); A7550E
(Antiferromagnetics); A7410 (Occurrence, critical
temperature); A7470H (Magnetic superconductors); A7550L
(Spin glasses)",
classification = "701; 708; 804; A7410 (Occurrence, critical
temperature); A7420F (BCS theory and its applications);
A7470H (Magnetic superconductors); A7470V (Perovskite
phase superconductors); A7550E (Antiferromagnetics);
A7550L (Spin glasses)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Raymond and Beverley Sackler Fac. of Exact Sci., Tel
Aviv Univ., Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Antiferromagnetic state; antiferromagnetic state; BCS
approximation; BCS theory; Copper Oxide--Magnetic
Properties; Doped planar CuO$_2$ systems; doped planar
CuO$_2$ systems; Ferromagnetic exchange; ferromagnetic
exchange; Ferromagnetic Exchange Couplings;
ferromagnetic properties of substances; glasses; High
temperature superconductors; high temperature
superconductors; High Temperature Superconductors;
high-; holes; Holes; La/sub 2-x/Sr$_x$CuO$_4$; La/sub
2-x/Sr$_x$CuO/sub 4/; Magnetic Frustration; Magnetic
frustration; magnetic frustration; Magnetic Phases;
Magnetic Properties; magnetic superconductors;
Magnetism--Ferromagnetism; measurement; performance;
phase; spin; spin-glass; Spin-glass phase; Spin-Glass
Phase; Superconducting Materials; superconducting
transition; superconducting transition temperature;
Superconducting transition temperature; Superconducting
Transition Temperature; superconductivity;
Superconductivity; temperature; temperature
superconductors",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "BCS theory; Ferromagnetic properties of substances;
High-temperature superconductors; Magnetic
superconductors; Spin glasses; Superconducting
transition temperature",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Deutscher:1989:SS,
author = "Guy Deutscher and Kazuyoshi Yamada",
title = "Short-coherence-length superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "293--298",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "We review the results of recent neutron-scattering
studies of the spin fluctuations in samples of
La$_{1.89}$Sr$_{0.11}$CuO$_4$ which are approximately
80\% superconducting with T$_c$ $=$ 10 K. The structure
factor, S(Q), reflects three-dimensional modulated spin
correlations with an in-plane correlation length of
order 18 \$POM 6 Angstrom. The fluctuations evolve with
temperature from being predominantly dynamic at high
temperatures to mainly quasi-elastic
(\$VBAR\$Delta@E\$VBAR \$LS 0.5 meV) at low
temperatures. No significant differences are observed
in the normal and superconducting states.",
abstract-2 = "The new high-T$_c$ oxides present some anomalous
electromagnetic properties, such as low critical
current densities, a reversible behavior of the
magnetization at fields much lower than H$_{c2}$, and
internal Josephson effects, that distinguish them from
the conventional low-T$_c$ metals and alloys. These
anomalous properties were first observed in
bulk-sintered samples and were often ascribed to the
poor connectivity of these ceramics. More recently, a
qualitatively similar behavior has been observed in
single crystals and oriented films. The fundamental
role of the short coherence length in determining the
behavior of the high-T$_c$ oxides is discussed. The
authors show that the short coherence lengths at the
local depressions of the order parameter at
crystallographic defects lead to reduced critical
currents and cause glassy behavior in the vicinity of
T$_c$.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Phys. and Astron., Tel Aviv Univ., Israel",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7460J (Critical currents); A7430C (Magnetization
curves, Meissner effect, penetration depth); A7450
(Proximity effects, tunnelling phenomena, and Josephson
effect); A7470V (Perovskite phase superconductors)",
classification = "701; 708; 804; 932; 933; A7430C (Magnetization
curves, Meissner effect, penetration depth); A7450
(Proximity effects, tunnelling phenomena, and Josephson
effect); A7460J (Critical currents); A7470V (Perovskite
phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Dept. of Phys. and Astron., Tel Aviv Univ., Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(superconductivity); Ceramics; ceramics; Coherence
length; coherence length; Critical current densities;
critical current densities; critical current density;
crystallographic; Crystallographic defects;
Crystals--Electric Conductivity; Current Densities;
defects; electromagnetic; Electromagnetic properties;
experimentation; films; glassy; Glassy, measurement;
high temperature superconductors; High temperature
superconductors; High Temperature Superconductors;
high-temperature superconductors; Internal Josephson
Effects; Josephson effect; Josephson effects; Lanthanum
Compounds--Electric Conductivity; magnetisation;
magnetization; Magnetization; Modulated Spin
Correlations; Neutrons--Scattering; order parameter;
Order parameter; oriented; Oriented films; Oriented
Films; Oxides; oxides; performance; Physical
Properties; properties; Short-Coherence-Length
Superconductors; Single crystals; single crystals;
Single Crystals; Spin Fluctuations; Superconducting
Materials; Superconducting States",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Coherence length; Critical current density
[superconductivity]; High-temperature superconductors;
Josephson effect; Magnetisation",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
xxnote = "Check page numbers: conflict between
\cite{Deutscher:1989:SS,Birgeneau:1989:QIN,Endoch:1989:QIN}.",
}
@Article{Chaudhari:1989:CCM,
author = "Praveen Chaudhari and Duane Dimos and Jochen
Mannhart",
title = "Critical current measurements in single crystals and
single-grain boundaries in {YBa}$_2$Cu$_3${O}$_7$
films",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "299--306",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The temperature, magnetic field, and orientation
dependence of the critical current density of
superconducting YBa$_2$Cu$_3$O$_7$ films have been
determined from transport measurements. The results
support a model of flux creep within single grains and
weak-link coupling across grain boundaries.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "YBa2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss O/ss
Y/ss",
classcodes = "A7460J (Critical currents); A7470V (Perovskite phase
superconductors); A7475 (Superconducting films); A7460G
(Flux pinning, flux motion, fluxon-defect
interactions)",
classification = "701; 708; 804; 812; 933; 942; A7460G (Flux pinning,
flux motion, fluxon-defect interactions); A7460J
(Critical currents); A7470V (Perovskite phase
superconductors); A7475 (Superconducting films)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(superconductivity); barium compounds; Ceramic
Materials; creep; Critical current density; critical
current density; Critical Current Measurements;
Crystals--Physical Properties; design, High temperature
superconductor; Electric Measurements--Current;
Electric Properties; experimentation; flux; Flux creep;
Flux Creep; flux creep; grain boundaries; high
temperature superconductor; High Temperature
Superconductors; high-; measurement; Oxides;
performance; Single Crystals; single crystals; Single
crystals; single-; Single-grain boundaries;
Single-Grain Boundaries; Superconducting Materials;
superconducting thin films; temperature
superconductors; Transport; transport; Weak-link
coupling; weak-link coupling; YBa$_2$Cu$_3$O$_7$ films;
YBa$_2$Cu/sub 3/O/sub 7/ films; Yttrium Barium Copper
Oxide; yttrium compounds; Yttrium Compounds--Thin
Films",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; Critical current density
[superconductivity]; Flux creep; Grain boundaries;
High-temperature superconductors; Superconducting thin
films; Yttrium compounds",
treatment = "X Experimental",
}
@Article{Morgenstern:1989:GBH,
author = "I. Morgenstern",
title = "Glassy behavior of high-{T}$_c$ superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "307--313",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper deals with the question of flux creep or
glassy behavior in high-T$_c$ superconducting single
crystals. It is shown that the flux creep picture is
merely a phenomenological approach to the glassy
behavior for relatively short times and low
temperatures. Glassy effects are predicted for
temperatures between 70\% and 95\% T$_c$ and magnetic
fields in the range of 0.03 T to 0.2 T. The glass
concept can be understood as a generalization of the
traditional flux creep picture. A hierarchy of energy
barriers dominates the physical behavior. An important
technical aspect is the influence of the glassiness on
critical currents.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab.",
affiliationaddress = "Zurich, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7460G (Flux pinning, flux motion, fluxon-defect
interactions); A7470V (Perovskite phase
superconductors); A7460J (Critical currents)",
classification = "701; 708; 812; 933; A7460G (Flux pinning, flux
motion, fluxon-defect interactions); A7460J (Critical
currents); A7470V (Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "behavior; critical; critical currents; Critical
Currents; Critical currents; Crystals; currents;
design, High temperature superconductors; energy
barriers; Energy barriers; experimentation; flux creep;
Flux Creep; Flux creep; Glass--Electric Conductivity;
Glassiness; glassy; Glassy behavior; high temperature
superconductors; High Temperature Superconductors;
high-temperature; measurement; performance; Physical
Properties; single crystals; Single Crystals; Single
crystals; Superconducting Materials; superconductors",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Critical currents; Flux creep; High-temperature
superconductors",
treatment = "T Theoretical or Mathematical",
}
@Article{Keller:1989:MRE,
author = "Hugo Keller",
title = "Muon-spin rotation experiments in high-{T}$_c$
superconductors and related materials",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "314--323",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Recent muon-spin rotation $\mu$SR experiments in
high-T$_c$ superconductors and related
antiferromagnetic materials are reviewed. The
possibilities and the limitations of the $\mu$SR method
for investigating these materials are briefly
discussed. In a high-T$_c$ superconductor, $\mu$SR is
an ideal tool with which to study the local magnetic
field distribution at the muon site, allowing a
determination of the London penetration depth. It is
further shown that $\mu$SR experiments may contribute
to the microscopic understanding of the superconducting
glass state in the high-T$_c$ oxides. In the related
antiferromagnetic materials $\mu$SR is a sensitive
method for detecting frozen local magnetic moments.",
acknowledgement = ack-nhfb,
affiliation = "Phys. Inst., Zurich Univ.",
affiliationaddress = "Zurich, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7470V
(Perovskite phase superconductors); A7430C
(Magnetization curves, Meissner effect, penetration
depth); A7675 (Muon spin rotation and relaxation);
A7550E (Antiferromagnetics)",
classification = "701; 708; A7430C (Magnetization curves, Meissner
effect, penetration depth); A7430G (Response to
electromagnetic fields, nuclear magnetic resonance,
ultrasonic attenuation); A7470V (Perovskite phase
superconductors); A7550E (Antiferromagnetics); A7675
(Muon spin rotation and relaxation)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Phys. Inst., Zurich Univ., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "(superconductivity); Antiferromagnetic materials;
antiferromagnetic materials; antiferromagnetic
properties of substances; design, High temperature
superconductors; experimentation; high temperature
superconductors; High Temperature Superconductors;
high-temperature; Local magnetic moments; local
magnetic moments; London penetration depth; Magnetic
Field Distribution; Magnetic
Materials--Antiferromagnetism; Magnetic Moments;
measurement; muon probes; Muon-Spin Rotation; Muon-spin
rotation; muon-spin rotation; oxides; Oxides;
penetration depth; Penetration Depth; performance;
Physical Properties; superconducting glass state;
Superconducting glass state; Superconducting Glass
State; Superconducting Materials; superconductors",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Antiferromagnetic properties of substances;
High-temperature superconductors; Muon probes;
Penetration depth [superconductivity]",
treatment = "X Experimental",
}
@Article{Blazey:1989:LMA,
author = "Keith William Blazey and Frederic H. Holtzberg",
title = "Low-field microwave absorption in single-crystal
superconducting {YBa}$_2${Cu}$_5${O}$_{7-\delta}$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "324--327",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The low-field microwave absorption line spectrum of a
single crystal of superconducting YBa$_2$Cu/sub
3/O$_{7-\delta}$ has been studied as a function of the
external magnetic field. The threshold microwave power
necessary to nucleate fluxons is found to vary with
field in such a way that only about one thousandth of
the junction length is active in interacting with the
microwaves to create fluxons.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab.",
affiliationaddress = "Rueschlikon, Switz",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7470V
(Perovskite phase superconductors); A7460G (Flux
pinning, flux motion, fluxon-defect interactions)",
classification = "701; 708; 804; 812; 933; A7430G (Response to
electromagnetic fields, nuclear magnetic resonance,
ultrasonic attenuation); A7460G (Flux pinning, flux
motion, fluxon-defect interactions); A7470V (Perovskite
phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "2/Cu/sub 3/O/sub 7- delta /; barium compounds; Ceramic
Materials; Crystals--Electric Conductivity; design,
High temperature superconductor; experimentation; flux
flow; fluxons; Fluxons; high temperature
superconductor; High Temperature Superconductors;
high-temperature; junction; Junction; Low-Field
Microwave Absorption; magnetic field; Magnetic field;
Magnetic Field Effects; measurement; Microwave
absorption; microwave absorption; Microwave Power;
Oxides; performance; Single Crystal; Single-crystal;
single-crystal; Superconducting Materials;
superconductors; YBa$_2$Cu$_3$O$_{7-\delta}$; YBa/sub;
Yttrium Barium Copper Oxide; yttrium compounds; Yttrium
Compounds--Electric Conductivity",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; Flux flow; High-temperature
superconductors; Yttrium compounds",
treatment = "X Experimental",
}
@Article{Maeno:1989:MEY,
author = "Yoshiteru Maeno and Christophe Rossel and Frederic H.
Holtzberg",
title = "Memory effects in {YBa}$_2${Cu}$_5${O}$_{7-\delta}$
single crystal",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "328--332",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements of the time dependence of
zero-field-cooled (ZFC) and field-cooled (FC)
magnetization M in YBa$_2$Cu$_3$O$_{7-\delta}$ single
crystal have been performed as a function of
temperature and magnetic field. The appearance of an
echo-like feature in the decay rate $S=dM/d \ln t$ at
an observing time $t$ equal to the waiting time $t_w$
during which the specimen was prepared at a given field
$H_0$ and temperature $T$ reveals aging effects in the
superconducting state. Similar phenomena reported in
spin glasses seem to validate the picture of a
superconducting glass state in
YBa$_2$Cu$_3${O}$_{7-\delta}$.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab.",
affiliationaddress = "Rueschlikon, Switz",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss",
classcodes = "A7430C (Magnetization curves, Meissner effect,
penetration depth); A7470V (Perovskite phase
superconductors)",
classification = "701; 708; 804; 812; 933; A7430C (Magnetization
curves, Meissner effect, penetration depth); A7470V
(Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "7- delta /; ageing; aging; Aging; barium compounds;
Ceramic Materials; crystal; Crystals--Magnetic
Properties; design; echo; Echo; experimentation;
field-cooled; Field-cooled; high temperature
superconductor; High temperature superconductor; High
Temperature Superconductors; high-temperature
superconductors; Magnetic Properties; magnetisation;
magnetization; Magnetization; measurement; memory;
Memory; Oxides; performance; single; Single crystal;
Single Crystal; Spin Glasses; Superconducting Glass;
superconducting glass state; Superconducting glass
state; Superconducting Materials; Superconducting
State; YBa$_2$Cu$_3$O$_{7-\delta}$; YBa$_2$Cu/sub
3/O/sub; Yttrium Barium Copper Oxide; yttrium
compounds; Yttrium Compounds--Electric Conductivity;
zero-field-cooled; Zero-field-cooled",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Ageing; Barium compounds; High-temperature
superconductors; Magnetisation; Yttrium compounds",
treatment = "X Experimental",
xxauthor = "C. Rossel and Y. Maeno and F. H. Holtzberg",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Peter:1989:PAH,
author = "Martin Peter",
title = "Positron annihilation and high-temperature
superconductivity",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "333--341",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "After a review of the theory of positron annihilation
techniques and of experimental principles, we give
examples of the determination of electron momentum
density and Fermi surfaces in alkali metals, transition
elements and compounds, and cerium. We discuss the
application of positrons in superconducting oxides. The
best results have been obtained in
YBa$_2$Cu$_3$O\$-7\$MIN@x\$/, with confirmation of
calculated band structure and observation of
discontinuity at the Fermi energy.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Phys. of Condensed Matter, Geneve Univ.",
affiliationaddress = "Geneva, Switz",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Ce/el; YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss
Y/ss",
classcodes = "A7870B (Positron annihilation); A7470V (Perovskite
phase superconductors); A7125H (Measurement of Fermi
surface parameters); A7125T (Band structure of
crystalline semiconductor compounds and insulators)",
classification = "549; 701; 708; 804; 812; 932; A7125H (Measurement of
Fermi surface parameters); A7125T (Band structure of
crystalline semiconductor compounds and insulators);
A7470V (Perovskite phase superconductors); A7870B
(Positron annihilation)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Dept. of Phys. of Condensed Matter, Geneve Univ.,
Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Alkali metals; alkali metals; Alkali Metals--Electric
Conductivity; Band structure; Band Structure; band
structure; band structure of crystalline semiconductors
and insulators; Ce; Ceramic Materials; design, High
temperature superconductors; Electron Momentum Density;
Electron momentum density; electron momentum density;
experimentation; Fermi energy; Fermi level; Fermi
surface; Fermi surfaces; Fermi Surfaces; high
temperature superconductors; high-; high-temperature;
High-Temperature Superconductivity; High-temperature
superconductivity; measurement; Oxides; Particle Beams;
performance; Physical Properties; Positron
Annihilation; Positron annihilation; positron
annihilation; positron annihilation in liquids and
solids; Superconducting Materials; Superconducting
Oxides; Superconducting oxides; superconducting oxides;
superconductors; temperature superconductivity;
Transition compounds; transition compounds; Transition
elements; transition elements; YBa$_2$Cu$_3$O$_{7-x}$;
YBa$_2$Cu/sub 3/O/sub 7-x/; Yttrium Compounds--Electric
Conductivity",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Band structure of crystalline semiconductors and
insulators; Fermi level; Fermi surface;
High-temperature superconductors; Positron annihilation
in liquids and solids",
treatment = "B Bibliography; G General Review",
}
@Article{Mehring:1989:NMR,
author = "Michael Mehring",
title = "Nuclear magnetic resonance in high-{T}$_c$
superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "342--350",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "This paper is aimed at the nonspecialist in nuclear
magnetic resonance who wants to know what NMR can do to
increase his understanding of high-T$_c$
superconductors. Most NMR results are discussed in an
illustrative manner to facilitate intuitive
understanding. Several NMR experiments are presented
which demonstrate the variety of this experimental
technique. Emphasis is given to the following aspects:
ionic charges and quadrupole interaction, local fields
and magnetic ordering, conduction electrons and Knight
shifts, quasiparticle excitations, and nuclear
spin-lattice relaxation.",
acknowledgement = ack-nhfb,
affiliation = "Physikalisches Inst., Stuttgart Univ.",
affiliationaddress = "Stuttgart, West Ger",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7470V
(Perovskite phase superconductors); A7660E (Relaxation
effects); A7660C (Chemical and Knight shifts)",
classification = "701; 708; 931; 932; A7430G (Response to
electromagnetic fields, nuclear magnetic resonance,
ultrasonic attenuation); A7470V (Perovskite phase
superconductors); A7660C (Chemical and Knight shifts);
A7660E (Relaxation effects)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Physikalisches Inst., Stuttgart Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Conduction electrons; conduction electrons; fields;
High Temperature Superconductors; high temperature
superconductors; high-temperature superconductors;
ionic charges; Ionic charges; Ionic Charges; Knight;
Knight shift; Knight shifts; Knight Shifts; local;
Local fields; magnetic ordering; Magnetic Ordering;
Magnetic ordering; magnetic resonance; measurement,
High temperature superconductors; NMR; nuclear; nuclear
magnetic; Nuclear magnetic resonance; Nuclear Magnetic
Resonance; nuclear spin-lattice; Nuclear spin-lattice
relaxation; nuclear spin-lattice relaxation; Nuclear
Spin-Lattice Relaxation; particles; performance;
Physical Properties; Quadrupole interaction; Quadrupole
Interaction; quadrupole interaction; quasi-;
quasiparticle excitations; Quasiparticle excitations;
relaxation; resonance; shifts; Superconducting
Materials",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "High-temperature superconductors; Knight shift;
Nuclear magnetic resonance; Nuclear spin-lattice
relaxation; Quasi-particles",
treatment = "G General Review",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Schneider:1989:CTG,
author = "T. Schneider",
title = "Critical temperature and the {Ginzburg--Landau} theory
of layered high-temperature superconductors",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "351--355",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Using the mean-field approximation, we study a model
for quasi-two-dimensional superconductors. The
interlayer coupling, assumed to be mediated by a small
electron-hopping term, is found to leave T$_c$
practically unaffected. Thus, a three-dimensional
pairing mechanism is required to explain the observed
rise in T$_c$ with decreasing average layer spacing in
the Bi and Tl compounds. Taking the inhomogeneities of
intrinsic or extrinsic nature into account, we find, in
the dirty limit, corrections to the conventional
anisotropic Ginzburg--Landau behavior-an upward
curvature of the upper critical fields which appears to
be a universal feature of layered superconductors.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab.",
affiliationaddress = "Zurich, Switz",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7420D (Phenomenological and two-fluid theories);
A7470V (Perovskite phase superconductors); A7460E
(Mixed state, H/sub c/sub 2, surface sheath); A7410
(Occurrence, critical temperature)",
classification = "701; 708; 804; 933; A7410 (Occurrence, critical
temperature); A7420D (Phenomenological and two-fluid
theories); A7460E (Mixed state, H/sub c$_2$, surface
sheath); A7470V (Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "IBM Res. Div., Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "anisotropic; Anisotropic; Bismuth Compounds--Electric
Conductivity; critical temperature; design, Critical
temperature; dirty limit; Dirty limit; dirty
superconductors; electron-hopping; Electron-hopping;
Ginzburg--Landau theory; Ginzburg--Landau Theory;
high-; High-Temperature Superconductors;
inhomogeneities; Inhomogeneities; Interlayer Coupling;
layered high-; Layered high-temperature
superconductors; Layered Superconductors; mean-field
approximation; Mean-field approximation; measurement;
pairing; Pairing; Physical Properties; quasi-;
Quasi-two-dimensional; Quasi-Two-Dimensional
Superconductors; superconducting critical field;
Superconducting Materials; superconducting transition
temperature; temperature superconductors; Thallium
Compounds--Electric Conductivity; Three-Dimensional
Pairing; two-dimensional; upper critical fields; Upper
critical fields",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Dirty superconductors; Ginzburg--Landau theory;
High-temperature superconductors; Superconducting
critical field; Superconducting transition
temperature",
treatment = "T Theoretical or Mathematical",
}
@Article{Kataoka:1989:IHS,
author = "Mitsuo Kataoka",
title = "Instability and high-{T}$_c$ superconductivity",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "356--364",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The interrelation between instability and a high
superconducting transition temperature T$_c$ is argued
theoretically in order to construct a model for the
origin of the high T$_c$ in the perovskite-type oxides.
It is shown that when two nearly degenerate bands
overlapping on the Fermi energy in $_F$ become unstable
against spontaneous splitting to give rise to a charge
redistribution, effective interactions between two
electrons in the same bands become attractive, and the
attractive interactions are strongly enhanced by
increasing the degree of instability. One cause of this
instability is the electron-phonon coupling, which
results in lattice-instability-enhanced
superconductivity; another cause is the Coulomb
interaction between electrons, which results in
electron-instability-caused superconductivity. The
latter mechanism is successfully applied to the
perovskite-type high-T$_c$ superconductors. Some
guidelines for obtaining a high T$_c$ are presented on
the basis of the present idea.",
acknowledgement = ack-nhfb,
affiliation = "Inst. for Mater. Res., Tohoko Univ.",
affiliationaddress = "Sendai, Jpn",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7420 (Theory); A7440 (Fluctuations and critical
effects); A7410 (Occurrence, critical temperature);
A7470V (Perovskite phase superconductors)",
classification = "549; 701; 708; 804; 812; 932; 933; A7410
(Occurrence, critical temperature); A7420 (Theory);
A7440 (Fluctuations and critical effects); A7470V
(Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Inst. for Mater. Res., Tohoko Univ., Sendai, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Alkali Metals--Electric Conductivity; Band Structure;
Ceramic Materials; Coulomb; Coulomb interaction;
Coulomb Interaction; Crystals; Degenerate bands;
Degenerate Bands; degenerate bands; design; Electron
Momentum Density; Electron-phonon coupling;
Electron-Phonon Coupling; electron-phonon coupling;
electron-phonon interactions; Fermi energy; Fermi
level; Fermi Surfaces; High temperature
superconductivity; high temperature superconductivity;
High Temperature Superconductors; high-temperature;
High-Temperature Superconductivity; Instability;
instability; interaction; measurement; Oxides; Particle
Beams; performance; Perovskite-type oxides;
Perovskite-Type Oxides; perovskite-type oxides;
Physical Properties; Positron Annihilation; Splitting;
splitting; Stability; Superconducting Materials;
Superconducting Materials--Physical Properties;
Superconducting Oxides; superconducting transition
temperature; Superconductivity; superconductors;
Transition temperature; transition temperature; Yttrium
Compounds--Electric Conductivity",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics \\ G.2.m Mathematics of Computing, DISCRETE
MATHEMATICS, Miscellaneous",
thesaurus = "Electron-phonon interactions; Fermi level;
High-temperature superconductors; Superconducting
transition temperature",
treatment = "T Theoretical or Mathematical",
}
@Article{Fossheim:1989:REP,
author = "Kristian Fossheim and Trygve Laegreid",
title = "A review of elastic properties of high-{T}$_c$
superconductors and some related {C}$_p$ results",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "365--371",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "First a brief survey is given of what can be learned
about important superconducting and normal-state
properties by ultrasonic and other elastic
measurements. Some of the characteristic elastic
properties of the La$_{2-x}$(Ba,Sr)$_x$CuO$_4$ and
YBa$_2$Cu$_3$O$_7$ systems are reviewed. In the
La-based family it is shown how the elastic
observations are closely related to structural and
soft-mode properties. The physics of YBa$_2$Cu/sub
3/O$_7$ is shown to be more complex. Finally, the
authors' recent results on the fluctuation contribution
to the specific heat near T$_c$ in YBa$_2$Cu/sub
3/O$_7$ are discussed.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Phys., Norwegian Inst. of Technol.",
affiliationaddress = "Trondheim, Norw",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "LaBaSrCuO4/ss Ba/ss Cu/ss La/ss O4/ss Sr/ss O/ss;
YBa2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss O/ss
Y/ss",
classcodes = "A7430G (Response to electromagnetic fields, nuclear
magnetic resonance, ultrasonic attenuation); A7430E
(Thermodynamic properties; thermal conductivity);
A7470V (Perovskite phase superconductors); A7440
(Fluctuations and critical effects)",
classification = "641; 701; 708; 753; 812; 931; A7430E (Thermodynamic
properties; A7430G (Response to electromagnetic fields,
nuclear magnetic resonance, ultrasonic attenuation);
A7440 (Fluctuations and critical effects); A7470V
(Perovskite phase superconductors); thermal
conductivity)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Div. of Phys., Norwegian Inst. of Technol., Trondheim,
Norway",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3/O/sub 7/; Ceramic Materials; design, High
temperature superconductors; elastic constants; elastic
properties; Elastic properties; Elasticity;
experimentation; fluctuation; Fluctuation; fluctuations
in superconductors; high temperature superconductors;
High Temperature Superconductors; high-; La/sub
2-x/(BaSr)$_x$CuO$_4$; La/sub 2-x/(BaSr)$_x$CuO/sub 4/;
measurement; normal-state; Normal-state; Oxides;
performance; soft modes; soft-mode; Soft-mode; solids;
specific heat; Specific heat; Specific Heat; specific
heat of; structural properties; Structural properties;
Superconducting Materials; temperature superconductors;
Ultrasonic Effects--Measurements; Ultrasonic
measurements; ultrasonic measurements; ultrasonic
velocity; YBa$_2$Cu$_3$O$_7$; YBa$_2$Cu/sub; Yttrium
Barium Copper Oxide; Yttrium Compounds--Electric
Conductivity",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Elastic constants; Fluctuations in superconductors;
High-temperature superconductors; Soft modes; Specific
heat of solids; Ultrasonic velocity",
treatment = "G General Review",
}
@Article{Fink:1989:ESS,
author = "J. Fink and N. N{\"u}cker and H. A. Romberg and J. C.
Fuggle",
title = "Electronic structure studies of high-{T}$_c$
superconductors by high-energy spectroscopies",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "372--381",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "A review of our high-energy spectroscopy studies of
the electronic structure of the new high-T$_c$
superconductors is given. X-ray-induced photoelectron
spectroscopy, bremsstrahlung-isochromat spectroscopy,
Auger electron spectroscopy, and electron energy-loss
spectroscopy have been used. Parameters determining the
correlated electronic structure have been derived,
together with information on the nature and the
symmetry of the charge carriers.",
acknowledgement = ack-nhfb,
affiliation = "Inst. fur Nukleare Festkorperphys.",
affiliationaddress = "Carlsruhe, West Ger",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7960 (Photoemission and photoelectron spectra);
A7145G (Exchange, correlation, dielectric and magnetic
functions, plasmons); A7470V (Perovskite phase
superconductors); A7920F (Electron impact: Auger
emission); A7125T (Band structure of crystalline
semiconductor compounds and insulators); A7870 (Other
interactions of matter with particles and radiation);
A7920K (Other electron impact phenomena)",
classification = "701; 708; 801; A7125T (Band structure of crystalline
semiconductor compounds and insulators); A7145G
(Exchange, correlation, dielectric and magnetic
functions, plasmons); A7470V (Perovskite phase
superconductors); A7870 (Other interactions of matter
with particles and radiation); A7920F (Electron impact:
Auger emission); A7920K (Other electron impact
phenomena); A7960 (Photoemission and photoelectron
spectra)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Inst. fur Nukleare Festkorperphys., Karlsruhe, West
Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "and insulators; Auger effect; Auger electron; Auger
electron spectroscopy; band structure of crystalline
semiconductors; Bremsstrahlung-isochromat spectroscopy;
bremsstrahlung-isochromat spectroscopy;
Bremsstrahlung-Isochromat Spectroscopy; correlated;
Correlated electronic structure; design; electron
energy loss spectra; Electron energy-loss spectroscopy;
electron energy-loss spectroscopy; Electron Energy-Loss
Spectroscopy; electronic structure; experimentation;
high temperature superconductors; High Temperature
Superconductors; High temperature superconductors;
high-; high-energy; High-Energy Spectroscopies;
High-energy spectroscopies; inverse photoemission;
measurement; Oxides; Photoelectron Spectroscopy;
Spectroscopic Analysis; spectroscopies; spectroscopy;
Superconducting Materials; symmetry; Symmetry,
performance; temperature superconductors; X-ray induced
photoelectron spectroscopy; X-ray photoelectron
spectra",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics \\ F.2.2 Theory of Computation, ANALYSIS OF
ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
Algorithms and Problems, Geometrical problems and
computations",
thesaurus = "Auger effect; Band structure of crystalline
semiconductors and insulators; Electron energy loss
spectra; High-temperature superconductors; Inverse
photoemission spectroscopy; X-ray photoelectron
spectra",
treatment = "X Experimental",
}
@Article{Axe:1989:NSM,
author = "John D. Axe and David E. Cox and Kim Mohanty and H.
Moudden and Arnold Moodenbaugh and Youwen Xu and Thomas
R. Thurston",
title = "A new structural modification of superconducting
{La}$_{2-x}${M}$_x${CuO}$_4$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "382--388 (or 382--387??)",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "La$_{1.9}$Ba$_{0.1}$CuO$_4$ has been observed to
undergo the following sequence of transformations upon
cooling from 300 K: tetragonal (I4/mmm) to orthorhombic
(Cmca) to tetragonal (P4$_2$/ncm). The newly discovered
low-temperature tetragonal structure can be understood
geometrically as arising from a coherent superposition
of the two domain modifications of the orthorhombic
structure. Dynamically, it results from a second
instability in the twofold degenerate soft modes of the
high-temperature tetragonal phase. Energetically, the
system can be modeled as an XY-spin system with
temperature-dependent quartic anisotropy v(T), and the
low-temperature transformation coincides with an
isotropic point v(T$_1$)=0. The relationship of the
newly discovered transformation to other anomalous
properties and to superconductivity is discussed
briefly.",
acknowledgement = ack-nhfb,
affiliation = "Brookhaven Nat. Lab.",
affiliationaddress = "Upton, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "La1.9Ba0.1CuO4/ss Ba0.1/ss La1.9/ss Ba/ss Cu/ss La/ss
O4/ss O/ss",
classcodes = "A6470K (Solid-solid transitions); A7470V (Perovskite
phase superconductors)",
classification = "701; 708; 804; 933; A6470K (Solid-solid
transitions); A7470V (Perovskite phase
superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Brookhaven Nat. Lab., Upton, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Anisotropy; anisotropy; barium compounds; Degenerate
Soft Modes; design; domain; Domain; Dynamics; dynamics;
experimentation; high temperature superconductor; High
temperature superconductor; High Temperature
Superconductors; high-temperature superconductors;
High-Temperature Tetragonal Phase; instability;
Instability; La$_{1.9}$Ba/sub 0.1/CuO$_4$, performance;
La/sub 1.9/Ba/sub 0.1/CuO/sub 4/; lanthanum compounds;
Lanthanum Compounds--Electric Conductivity;
Low-Temperature Tetragonal Structure; measurement;
orthorhombic; Orthorhombic Structure; Orthorhombic
structure; Oxides; Physical Properties; Quartic
Anisotropy; soft modes; Soft modes; solid-state phase;
structural transformations; Structural transformations;
structure; Superconducting Materials; tetragonal
structure; Tetragonal structure; transformations;
XY-spin system",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; High-temperature superconductors;
Lanthanum compounds; Soft modes; Solid-state phase
transformations",
treatment = "X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{vanKempen:1989:EDA,
author = "Herman {van Kempen} and Henk F. Hoevers and P. Jan M.
{van Bentum} and A. J. G. Schellingerhout and D. {van
der Marel}",
title = "Energy dependence of the {Andreev} reflection of
{YBa}$_2${Cu}$_5${O}$_{7-\delta}$",
journal = j-IBM-JRD,
volume = "33",
number = "3",
pages = "389--393",
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "Measurements of the energy dependence of the Andreev
reflection have been performed on a Ag-YBa$_2$Cu/sub
3/O$_{7-\delta}$ interface. The observation of the
Andreev reflection indicates a ground state of
zero-momentum pairs. It is shown that, in principle,
the bulk Delta (electron pair potential) can be
determined from the energy dependence of the Andreev
reflection. In the present experiment, however, due to
the limited mean free path of the electrons in the
silver, only a lower limit of Delta was found.",
acknowledgement = ack-nhfb,
affiliation = "Res. Inst. for Mater.",
affiliationaddress = "Nijmegen, Neth",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Ag-YBa2Cu3O/int YBa2Cu3O/int Ba2/int Cu3/int Ag/int
Ba/int Cu/int O/int Y/int YBa2Cu3O/ss Ba2/ss Cu3/ss
Ba/ss Cu/ss O/ss Y/ss Ag/el",
classcodes = "A7450 (Proximity effects, tunnelling phenomena, and
Josephson effect); A7470V (Perovskite phase
superconductors)",
classification = "701; 708; 804; 812; 933; A7450 (Proximity effects,
tunnelling phenomena, and Josephson effect); A7470V
(Perovskite phase superconductors)",
conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
corpsource = "Res. Inst. for Mater., Nijmegen Univ., Netherlands",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "3/O/sub 7- delta / interface;
Ag-YBa$_2$Cu$_3$O$_{7-\delta}$ interface; Ag-YBa/sub
2/Cu/sub; Andreev reflection; Andreev Reflection;
barium compounds; Ceramic Materials; compounds; design,
High temperature superconductor; Electron pair
potential; electron pair potential; experimentation;
high temperature superconductor; High Temperature
Superconductors; high-temperature superconductors; Mean
Free Path; measurement; momentum pairs; Oxides;
performance; Physical Properties; Superconducting
Materials; yttrium; Yttrium Barium Copper Oxide;
Yttrium Compounds--Electric Conductivity; zero-;
Zero-momentum pairs; Zero-Momentum Pairs",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Barium compounds; High-temperature superconductors;
Yttrium compounds",
treatment = "X Experimental",
}
@Article{Pareschi:1989:MIP,
author = "Maria Teresa Pareschi and Ralph Bernstein",
title = "Modeling and image processing for visualization of
volcanic mapping",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "406--416 (or 406--415??)",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "In countries where active volcanoes are located in
highly populated areas, the problem of risk reduction
is very important. Actual knowledge about volcanic
behavior does not allow deterministic event prediction
or the forecasting of eruptions. However, areas exposed
to eruptions can be analyzed if eruption
characteristics can be inferred or assumed. Models to
simulate volcanic eruptions and identify hazardous
areas have been developed by collaboration between the
IBM Italy Pisa Scientific Center and the Earth Science
Department of Pisa University The input to the models
is the set of assumed eruption characteristics: the
typology of the phenomenon (ash fall, pyroclastic flow,
etc.), vent position, total eruptible mass, wind
profile, etc. The output of the models shows volcanic
product distribution at ground level. These models are
reviewed and their use in hazard estimation (compared
with the more traditional techniques currently in use)
is outlined.",
abstract-2 = "Models to simulate volcanic eruptions and identify
hazardous areas have been developed by collaboration
between the IBM Italy Pisa Scientific Center and the
Earth Science Department of Pisa University (supported
by the Italian National Group of Volcanology of the
Italian National Research Council). The input to the
models is the set of assumed eruption characteristics:
the typology of the phenomenon (ash fall, pyroclastic
flow, etc.), vent position, total eruptible mass, wind
profile, etc. The output of the models shows volcanic
product distribution at ground level. These models are
reviewed and their use in hazard estimation (compared
with the more traditional techniques currently in use)
is outlined. Effective use of these models, by public
administrators and planners in preparing plans for the
evacuation of hazardous zones, requires the clear and
effective display of model results. Techniques to
display and visualize such data have been developed by
the authors. In particular, a computer program has been
implemented on the IBM 7350 Image Processing System to
display model outputs, representing both volume (in two
dimensions) and distribution of ejected material, and
to superimpose the displays upon satellite images that
show 3D oblique views of terrain.",
acknowledgement = ack-nhfb,
affiliation = "IBM Pisa Sci., Centre, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "A9140 (Volcanology); C7340 (Geophysics); C5260B
(Computer vision and picture processing)",
classification = "484; 723; 741; 751; A9140 (Volcanology); C5260B
(Computer vision and picture processing); C7340
(Geophysics)",
corpsource = "IBM Pisa Sci., Centre, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Acoustic Waves; Applications; Ash fall; ash fall;
Computer Graphics; Computer program; computer program;
computerised picture processing; design; eruptible
mass; evacuation; Evacuation; geophysics computing;
Hazard estimation; hazard estimation; Hazard Mapping;
hazardous areas; Hazardous areas; IBM 7350; IBM 7350
Image Processing System; IBM Italy Pisa Scientific
Center; Image Processing; image processing; Image
Processing System; Maps and Mapping; Pisa; Pisa
University; Pyroclastic flow; pyroclastic flow;
Satellite images; satellite images; Simulation Models;
theory, Image processing; total; Total eruptible mass;
University; Vent position; vent position; Volcanic
eruptions; Volcanic Eruptions; volcanic eruptions;
Volcanic mapping; volcanic mapping; Volcanic Mapping;
Volcanic product distribution; volcanic product
distribution; Volcanoes--Computer Simulation;
volcanology; wind profile; Wind profile",
subject = "J.2 Computer Applications, PHYSICAL SCIENCES AND
ENGINEERING, Earth and atmospheric sciences \\ I.2.10
Computing Methodologies, ARTIFICIAL INTELLIGENCE,
Vision and Scene Understanding, Modeling and recovery
of physical attributes \\ I.4.9 Computing
Methodologies, IMAGE PROCESSING, Applications",
thesaurus = "Computerised picture processing; Geophysics computing;
Volcanology",
treatment = "P Practical",
}
@Article{OConnor:1989:NQP,
author = "Michael A. O'Connor",
title = "Natural quadrics: {Projections} and intersections",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "417--446",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68U05 (51-04)",
MRnumber = "90g:68140",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "681.51016",
abstract = "Geometrical modelers usually strive to support at
least solids bounded by the results of Boolean
operations on planes, spheres, cylinders, and cones,
that is, the natural quadrics. Most often this set is
treated as a subset of the set of quadric surfaces.
Although the intersection of two quadrics is a
mathematically tractable problem, in implementation it
leads to complexity and stability problems. Even in the
restriction to the natural quadrics these problems can
persist. This paper presents a method which, by using
the projections of natural quadrics onto planes and
spheres, reduces the intersection of two natural
quadrics to the calculation of the intersections of
lines and circles on planes and spheres. In order to
make the claims of the method easily verifiable and
provide the tools necessary for implementation,
explicit descriptions of the projections are also
included.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Centre",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4290 (Other computer theory)",
classification = "921; 931; C4290 (Other computer theory)",
corpsource = "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Boolean operations; Complexity; complexity;
computational geometry; cones; Cones; Cylinder/Cone
Intersection; Cylinders; cylinders;
Cylinders--Mathematical Models; design; Domain
Segmentation; Explicit descriptions; explicit
descriptions; Levin's Method; Mathematical Models;
Mathematical Techniques--Geometry; Mathematically
tractable problem; mathematically tractable problem;
Natural quadrics; Natural Quadrics; natural quadrics;
Planar Projections; Planes; planes; Quadrics
Intersections; solid modelling; Spheres; spheres;
stability; Stability; theory; verification, Boolean
operations",
subject = "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
Computational Geometry and Object Modeling, Curve,
surface, solid, and object representations \\ G.2.m
Mathematics of Computing, DISCRETE MATHEMATICS,
Miscellaneous \\ F.2.2 Theory of Computation, ANALYSIS
OF ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
Algorithms and Problems, Geometrical problems and
computations",
thesaurus = "Computational geometry; Solid modelling",
treatment = "T Theoretical or Mathematical",
}
@Article{Tang:1989:FLS,
author = "C. L. Tang and F. W. Wise and M. J. Rosker and I. A.
Walmsley",
title = "Femtosecond laser studies of the relaxation dynamics
of semiconductors and large molecules",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "447--455",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The use of femtosecond lasers and the related optical
correlation spectroscopic technique for studying the
relaxation dynamics of semiconductors and photoexcited
molecules are reviewed. In particular, the results on
the intraband relaxation of nonequilibrium carriers in
GaAs and related compounds and quantum well structures
are summarized. The optical correlation technique also
led to the observation of quantum beats in the
femtosecond time domain corresponding to the direct
observation of molecular vibrations in the time
domain.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. Eng., Cornell Univ., Ithaca, NY,
USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
classcodes = "A7847 (Time-resolved optical spectroscopies and other
ultrafast optical measurements in condensed matter);
A7865J (Nonmetals); A3380 (Photon interactions with
molecules)",
classification = "714; 744; 801; 931; A3380 (Photon interactions with
molecules); A7847 (Time-resolved optical spectroscopies
and other ultrafast optical measurements in condensed
matter); A7865J (Nonmetals)",
corpsource = "Dept. of Electr. Eng., Cornell Univ., Ithaca, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "carrier relaxation time; design; experimentation;
Femtosecond Laser Studies; femtosecond lasers;
Femtosecond lasers; GaAs; gallium arsenide; III-V;
intraband relaxation; Intraband relaxation;
Lasers--Applications; measurement; measurement by laser
beam; molecular; molecules; Molecules; Nonequilibrium
Carriers; optical correlation; Optical correlation
spectroscopic technique; Optical Correlation
Spectroscopic Techniques; performance; photoexcitation;
photoexcited; Photoexcited molecules; Photoexcited
Molecules; photon correlation spectroscopy; quantum
beats; Quantum beats; quantum well structures; Quantum
well structures; Quantum Well Structures; relaxation
dynamics; Relaxation Dynamics; Semiconducting Gallium
Arsenide--Charge Carriers; Semiconductor Materials;
semiconductor quantum wells; semiconductors;
Semiconductors; Spectroscopic Analysis; spectroscopic
technique; theory, Relaxation dynamics",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Carrier relaxation time; Gallium arsenide; III-V
semiconductors; Measurement by laser beam; Molecular
photoexcitation; Photon correlation spectroscopy;
Semiconductor quantum wells",
treatment = "X Experimental",
}
@Article{He:1989:EQP,
author = "Shanjin He and Julian D. Maynard",
title = "Effects of quasiperiodic ({Penrose} tile) symmetry on
the eigenvalues and eigenfunctions of the wave
equation",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "456--463",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The use of femtosecond lasers and the related optical
correlation spectroscopic technique for studying the
relaxation dynamics of semiconductors and photoexcited
molecules are reviewed. In particular, the results on
the intraband relaxation of nonequilibrium carriers in
GaAs and related compounds and quantum well structures
are summarized. The optical correlation technique also
led to the observation of quantum beats in the
femtosecond time domain corresponding to the direct
observation of molecular vibrations in the time
domain.",
abstract-2 = "In addition to the basic crystalline and amorphous
structures for solids, it is possible that solids may
also form with a quasiperiodic, or Penrose tile,
structure. A current problem in condensed-matter
physics is to determine how this structure affects the
various physical properties of a material. A
fundamental question involves the consequences of
quasiperiodic symmetry in the eigenvalue spectrum and
eigenfunctions of a wave equation. While rigorous
theorems have been derived for one-dimensional systems,
there is currently no known `quasi-Bloch theorem' for
two and three dimensions. To gain insight into this
problem, an acoustic experiment has been used to study
a two-dimensional wave system with a Penrose tile
symmetry. The results show an eigenvalue spectrum
containing bands and gaps with widths which are in the
ratio of the Golden Mean, ($\sqrt{5} + 1/2$).",
acknowledgement = ack-nhfb,
affiliation = "University Park",
affiliationaddress = "University Park, PA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6265 (Acoustic properties of solids); A6150E (Crystal
symmetry; models and space groups, and crystalline
systems and classes)",
classification = "714; 744; 801; 921; 931; 933; A6150E (Crystal
symmetry; A6265 (Acoustic properties of solids); models
and space groups, and crystalline systems and
classes)",
corpsource = "Dept. of Phys., Pennsylvania State Univ., University
Park, PA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Acoustic experiment; acoustic experiment; acoustic
wave propagation; Condensed Matter Physics;
Condensed-matter physics; condensed-matter physics;
crystal symmetry; design; Eigenfunctions;
eigenfunctions; Eigenvalues; eigenvalues; eigenvalues
and; Femtosecond Laser Studies; Golden; Golden Mean;
Lasers--Applications; Mathematical
Techniques--Eigenvalues and Eigenfunctions; Mean;
measurement; Molecules; Nonequilibrium Carriers;
Optical Correlation Spectroscopic Techniques; Penrose
tile; Penrose Tile Symmetry; performance; Photoexcited
Molecules; Physics; Quantum Well Structures;
Quasi-Bloch theorem; quasi-Bloch theorem;
quasicrystals; Quasiperiodic; quasiperiodic;
Quasiperiodic Symmetry; Relaxation Dynamics;
Semiconducting Gallium Arsenide--Charge Carriers;
Semiconductor Materials; Solid State; Solids;
Spectroscopic Analysis; theory; Two Dimensional Wave
System; Two-dimensional wave system; two-dimensional
wave system; Wave Equation; Wave equation; wave
equation",
subject = "G.1.3 Mathematics of Computing, NUMERICAL ANALYSIS,
Numerical Linear Algebra, Eigenvalues \\ G.1.m
Mathematics of Computing, NUMERICAL ANALYSIS,
Miscellaneous \\ J.2 Computer Applications, PHYSICAL
SCIENCES AND ENGINEERING, Physics",
thesaurus = "Acoustic wave propagation; Crystal symmetry;
Eigenvalues and eigenfunctions; Quasicrystals",
treatment = "X Experimental",
}
@Article{Yetzer:1989:TSM,
author = "Roger H. Yetzer",
title = "Time series in {M} dimensions: The power spectrum",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "464--469",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
abstract = "The approach presented here extends the modeling of
M-dimensional (spatial) time series from the time
domain into the frequency domain. The autocovariance
function for an M-dimensional time series is
transformed to obtain the power spectrum in M
dimensions. The latter describes the variance within
the series and can be used to identify dependencies
and\slash or test the adequacy of a fitted model. An
example is provided.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp.",
affiliationaddress = "Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0240Z (Other and miscellaneous); C1140Z (Other and
miscellaneous)",
classification = "921; 922; B0240Z (Other and miscellaneous); C1140Z
(Other and miscellaneous)",
corpsource = "IBM Corp., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Autocovariance Function; Autocovariance function;
autocovariance function; design; domain; fitted; Fitted
model; frequency domain; Frequency domain; Frequency
Domain; M Dimensional Power Spectrum; M Dimensional
Time Series; M-dimensional; Mathematical
Transformations; measurement; model; Modeling;
modeling; performance; power spectrum; Power Spectrum
Estimation; series (mathematics); Spatial Time Series;
Spectrum Analysis; Statistical Methods; stochastic
processes; theory, Power spectrum; time; Time domain;
Time series; time series; Time Series Analysis",
subject = "G.3 Mathematics of Computing, PROBABILITY AND
STATISTICS, Statistical computing",
thesaurus = "Series [mathematics]; Stochastic processes",
treatment = "T Theoretical or Mathematical",
}
@Article{Patel:1989:TLC,
author = "Arvind M. Patel",
title = "Two-level coding for error control in magnetic disk
storage products",
journal = j-IBM-JRD,
volume = "33",
number = "4",
pages = "470--484",
month = jul,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
ZMnumber = "709.94653",
abstract = "Error-control coding has played a significant role in
the design and development of magnetic recording
storage products. The trend toward higher densities and
data rates presents continuing demands for an ability
to operate at a lower signal-to-noise ratio and to
tolerate an increased number of correctable errors.
Heretofore, the magnetic disk storage products used
coding schemes that provided correction of one burst of
errors in a record of length ranging from a few bytes
of data to a full track on the disk. In this paper, the
author presents a new coding architecture that
facilitates correction of multiple-burst errors in each
record in a typical disk storage application. This
architecture embodies a two-level coding scheme which
offers high coding efficiency along with a fast
decoding strategy that closely matches the requirements
of on-line correction of multiple bursts of errors. The
first level has a smaller block delay and provides very
fast correction of most of the errors commonly
encountered in an average disk file. The second level,
on a larger block size, provides reserve capability for
correcting additional errors.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Products Div.",
affiliationaddress = "San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B6120B (Codes); C5320C
(Storage on moving magnetic media)",
classification = "722; 723; 921; B3120B (Magnetic recording); B6120B
(Codes); C5320C (Storage on moving magnetic media)",
corpsource = "IBM Gen. Products Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Applications; Codes, Symbolic; coding; Coding
architecture; coding architecture; Coding Architecture;
Coding efficiency; Coding schemes; coding schemes; data
rates; Data rates; Data Storage, Magnetic--Disk;
Decoding strategy; decoding strategy; design;
efficiency; encoding; error control; Error Control
Coding; error correction codes; Error Rate Performance;
magnetic disc storage; Magnetic disk storage products;
Magnetic Disk Storage Products; magnetic disk storage
products; measurement; Multiple Burst Errors;
multiple-burst errors; Multiple-burst errors;
performance; Signal-to-noise ratio; signal-to-noise
ratio; storage management; theory; Two-Level Coding;
two-level coding scheme; Two-level coding scheme;
verification, Error control",
subject = "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
B.3.4 Hardware, MEMORY STRUCTURES, Reliability,
Testing, and Fault-Tolerance \\ C.4 Computer Systems
Organization, PERFORMANCE OF SYSTEMS, Performance
attributes \\ E.4 Data, CODING AND INFORMATION THEORY",
thesaurus = "Encoding; Error correction codes; Magnetic disc
storage; Storage management",
treatment = "P Practical",
}
@Article{Alfonseca:1989:FSN,
author = "M. Alfonseca",
title = "Frames, semantic networks, and object-oriented
programming in {APL2}",
journal = j-IBM-JRD,
volume = "33",
number = "5",
pages = "502--510",
month = sep,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Discusses the capabilities of APL2 for the
implementation of frame systems and semantic networks,
and for the use of object-oriented programming
techniques. The fact that the frame is a basic data
structure of APL2 makes this language very appropriate
for the development of artificial intelligence
applications using the indicated techniques. Examples
are given of the way in which they may be applied to
realistic situations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6110 (Systems analysis
and programming); C6120 (File organisation)",
classification = "C6110 (Systems analysis and programming); C6120
(File organisation); C6140D (High level languages)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; APL2; applications; artificial intelligence;
Artificial intelligence applications; data structure;
Data structure; data structures; design; frame; Frame
systems; languages; object-; object-oriented
programming; Object-oriented programming; oriented
programming; semantic networks; systems; theory,
Semantic networks",
subject = "D.3.2 Software, PROGRAMMING LANGUAGES, Language
Classifications, APL \\ D.1.m Software, PROGRAMMING
TECHNIQUES, Miscellaneous \\ D.3.3 Software,
PROGRAMMING LANGUAGES, Language Constructs, Data types
and structures",
thesaurus = "APL; Artificial intelligence; Data structures;
Object-oriented programming",
treatment = "P Practical",
}
@Article{Smith:1989:DEC,
author = "W. E. Smith and K. S. Trivedi",
title = "Dependability evaluation of a class of multi-loop
topologies for local area networks",
journal = j-IBM-JRD,
volume = "33",
number = "5",
pages = "511--523",
month = sep,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Local area networks have been developed using both
ring and bus topologies. Multi-loop and multi-connected
topologies have been proposed to improve the throughput
and dependability of single-loop networks. The authors
evaluate the dependability of a class of
multi-connected loop topologies called forward loop,
backward hop (FLBH) networks and compare them to simple
ring networks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); C5620L (Local area
networks)",
classification = "B6210L (Computer communications); C5620L (Local area
networks)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "backward hop; Backward hop; bus topologies; Bus
topologies; dependability; Dependability; design;
forward loop; Forward loop; local area networks; Local
area networks; measurement; multi-connected topologies;
Multi-connected topologies; multi-loop topologies;
network topology; performance; reliability; ring
networks; Ring networks; theory; throughput;
Throughput; verification, Multi-loop topologies",
subject = "C.2.5 Computer Systems Organization,
COMPUTER-COMMUNICATION NETWORKS, Local Networks \\ C.4
Computer Systems Organization, PERFORMANCE OF SYSTEMS
\\ F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
DEVICES, Modes of Computation, Probabilistic
computation",
thesaurus = "Local area networks; Network topology",
treatment = "P Practical",
}
@Article{Matick:1989:ADO,
author = "R. Matick and R. Mao and S. Ray",
title = "Architecture, design, and operating characteristics of
a 12-ns {CMOS} functional cache chip",
journal = j-IBM-JRD,
volume = "33",
number = "5",
pages = "524--539",
month = sep,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This cache chip incorporates a number of unique
on-chip functions as well as unique design, providing a
one-cycle cache in which translation can be overlapped
with cache access. In order to achieve high average
performance, a cache should give the appearance of
being a two-ported array in order to provide high
bandwidth both to the processor during normal execution
and to the main memory during reload. But a true
two-port design is undesirable as well as unnecessary,
especially since the reload process is typically
limited by the memory speed and other system
parameters. A significant improvement can be obtained
by judicious choice as well as proper integration of
some critical functions placed directly on the cache
chips. This paper describes these functions and
integration onto a 72 K-bit static RAM chip,
implemented in 1-$\mu$m CMOS technology for high speed
and overall system performance. In addition, the chip
I/O is selectable for either ECL or TTL
compatibility.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage)",
classification = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1 micron; 1 Micron; 12 ns; 12 Ns; 72 kbit; 72 Kbit;
bandwidth; Bandwidth; buffer storage; cache access;
Cache access; chip I/O; Chip I/O; circuits; CMOS; CMOS
functional cache chip; CMOS integrated circuits;
critical functions; Critical functions; design; ECL
compatibility; functional cache chip; integrated
memory; measurement; memory speed; Memory speed;
on-chip functions; On-chip functions; one-cycle cache;
One-cycle cache; operating characteristics; Operating
characteristics; performance; random-access storage;
reload process; Reload process; static RAM chip; Static
RAM chip; theory, ECL compatibility; TTL compatibility;
two-ported array; Two-ported array",
numericalindex = "Time 1.2E-08 s; Storage capacity 7.4E+04 bit; Size
1.0E-06 m",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Memory technologies \\ B.3.2 Hardware, MEMORY
STRUCTURES, Design Styles, Cache memories \\ C.4
Computer Systems Organization, PERFORMANCE OF SYSTEMS",
thesaurus = "Buffer storage; CMOS integrated circuits; Integrated
memory circuits; Random-access storage",
treatment = "P Practical; X Experimental",
}
@Article{vandenBerg:1989:ODS,
author = "H. A. M. {van den Berg}",
title = "Order in the domain structure in soft-magnetic
thin-film elements: a review",
journal = j-IBM-JRD,
volume = "33",
number = "5",
pages = "540--582",
month = sep,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The domain structure and its development in thin
plane-parallel soft-magnetic elements have been
investigated from both the experimental and the
theoretical point of view. The experimental
observations for verifying the predictions have been
realized by means of the Bitter, Kerr, and Lorentz
techniques. In the first part, a self-consistent domain
theory, based on micromagnetic principles, is unfolded
for two-dimensional solenoidal magnetization
distributions present in ideally soft-magnetic
thin-film objects that are rectangular cylinders. The
solenoidality implies that both the external field and
the conduction currents are taken as zero. Two types of
domain structures are distinguished: the basic
structures in simply connected regions and the parallel
configurations in special types of multiply connected
regions-the parallel regions. A number of experimental
examples are provided. In the second part, the M
distribution is studied.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7570K (Domain structure (magnetic bubbles)); A7560C
(Domain walls and domain structure); A0130R (Reviews
and tutorial papers; resource letters); B3110C
(Ferromagnetic materials); B3120N (Magnetic thin film
devices)",
classification = "A0130R (Reviews and tutorial papers; A7560C (Domain
walls and domain structure); A7570K (Domain structure
(magnetic bubbles)); B3110C (Ferromagnetic materials);
B3120N (Magnetic thin film devices); resource
letters)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bitter technique; conduction currents; Conduction
currents; design; devices; domain structure; Domain
structure; elements; experimentation; external;
External field; ferromagnetism; field; Kerr techniques;
Lorentz techniques; M distribution; magnetic domains;
magnetic thin film; magnetic thin films; magnetic
thin-film elements; magnetisation; magnetization
distributions; measurement; micromagnetic principles;
Micromagnetic principles; multiply connected regions;
Multiply connected regions; parallel configurations;
Parallel configurations; performance; plane-parallel
soft-magnetic; Plane-parallel soft-magnetic elements;
rectangular cylinders; Rectangular cylinders; reviews;
self-consistent domain theory; Self-consistent domain
theory; soft-; Soft-magnetic thin-film elements;
theory, Kerr techniques; two-dimensional solenoidal;
Two-dimensional solenoidal magnetization
distributions",
subject = "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
Styles, Advanced technologies \\ G.m Mathematics of
Computing, MISCELLANEOUS \\ F.1.2 Theory of
Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
Computation, Probabilistic computation \\ A.1 General
Literature, INTRODUCTORY AND SURVEY \\ J.2 Computer
Applications, PHYSICAL SCIENCES AND ENGINEERING,
Physics",
thesaurus = "Ferromagnetism; Magnetic domains; Magnetic thin film
devices; Magnetic thin films; Magnetisation; Reviews",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Franaszek:1989:CCC,
author = "P. A. Franaszek",
title = "Coding for constrained channels: a comparison of two
approaches",
journal = j-IBM-JRD,
volume = "33",
number = "6",
pages = "602--608",
month = nov,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Discusses the relation between some early techniques
for constrained channel coding and more recent ones
adapted from the mathematical area of symbolic
dynamics. A primary difference between the two is that
the latter focus on issues of code existence whereas
the former were primarily concerned with code
construction and optimality.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6110 (Information theory); B6120B (Codes); C1260
(Information theory)",
classification = "B6110 (Information theory); B6120B (Codes); C1260
(Information theory)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "code construction; Code construction; code existence;
Code existence; constrained channels; Constrained
channels; encoding; information theory; optimality;
Optimality; symbolic dynamics; Symbolic dynamics;
telecommunication channels",
thesaurus = "Encoding; Information theory; Telecommunication
channels",
treatment = "T Theoretical or Mathematical",
}
@Article{Zable:1989:MPA,
author = "J. L. Zable and E. F. Helinski",
title = "Matrix print actuator for dot band printer",
journal = j-IBM-JRD,
volume = "33",
number = "6",
pages = "609--617",
month = nov,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The design selection of an impact matrix print
actuator is described, along with its method of design
and optimization. The dot band printer concept is
discussed in conjunction with operational requirements
for the hammer; these requirements, and methods of
meeting them, are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5550 (Printers, plotters and other hard-copy output
devices)C3260B (Electric equipment)",
classification = "C3260B (Electric equipment); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Data Syst. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "actuator; design selection; Design selection; dot band
printer; Dot band printer; electric actuators; hammer;
Hammer; impact matrix print; Impact matrix print
actuator; matrix printers; optimization; Optimization",
thesaurus = "Electric actuators; Matrix printers",
treatment = "A Application; P Practical",
}
@Article{Irvin:1989:PIC,
author = "D. R. Irvin",
title = "Preserving the integrity of cyclic-redundancy checks
when protected text is intentionally altered",
journal = j-IBM-JRD,
volume = "33",
number = "6",
pages = "618--626",
month = nov,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "As a digitally encoded message traverses a series of
point-to-point communication links, it may be necessary
to change the contents of that message at an
intermediate station. If bit errors are introduced by
the intermediary while the text is unprotected, these
errors will be subsequently undetectable by cyclic
redundancy checks. An algorithm is presented here for
ensuring that such errors will not go undetected. Since
the cyclic redundancy check is based on a linear
mathematical operation, the frame-check sequence may be
modified, rather than recalculated, by each
intermediary changing the protected text. A frame-check
sequence constructed in this way will reveal any errors
introduced in the transmission path when the message is
finally examined at the ultimate destination. Examples
of the proposed technique applied to various local-area
network bridges are developed. The technique is shown
to be beneficial in these examples when the internal
bit-error ratio of the text-changing device exceeds
10/sup -19/ on unprotected paths.",
acknowledgement = ack-nhfb,
affiliation = "IBM Commun. Syst., US Telecommun. Center, Research
Triangle Park, NC, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6120B (Codes);
C5620L (Local area networks)",
classification = "B6120B (Codes); B6210L (Computer communications);
C5620L (Local area networks)",
corpsource = "IBM Commun. Syst., US Telecommun. Center, Research
Triangle Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bit errors; Bit errors; cyclic-redundancy checks;
Cyclic-redundancy checks; digitally encoded; Digitally
encoded message; error detection codes; frame-check;
Frame-check sequence; intermediary; Intermediary;
internal bit-error; Internal bit-error ratio; linear
mathematical operation; Linear mathematical operation;
local area networks; local-area network bridges;
Local-area network bridges; message; point-to-point
communication links; Point-to-point communication
links; protected text; Protected text; ratio; sequence;
switching; text-changing device; Text-changing device",
thesaurus = "Error detection codes; Local area networks; Message
switching",
treatment = "T Theoretical or Mathematical",
}
@Article{Fordyce:1989:RKF,
author = "K. Fordyce and J. Jantzen and G. A. {Sullivan, Sr.}
and G. A. {Sullivan, Jr.}",
title = "Representing knowledge with functions and {Boolean}
arrays",
journal = j-IBM-JRD,
volume = "33",
number = "6",
pages = "627--646",
month = nov,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Over the past eighteen years a variety of advanced
decision support systems have been built with
knowledge-based expert system (KBES) components. For
the past eight years, a knowledge representation and
manipulation (KRM) scheme called FABA (Functions And
Boolean Arrays) has been used. It has two basic
principles. First, knowledge is viewed as a functional
mapping between input and output variables, where the
functions are expressed as fact tables or bases and
procedure modules. Second, the function network can be
represented with Boolean arrays. The basics of FABA,
its implementation in APL2, and a simple example of
FABA's application in a manufacturing dispatch
application for IBM's semiconductor facility in
Burlington, Vermont, are described in this paper.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Eng./Sci. Comput. Center,
Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7160 (Manufacturing and industry); C7102 (Decision
support systems); C6170 (Expert systems)",
classification = "C6170 (Expert systems); C7102 (Decision support
systems); C7160 (Manufacturing and industry)",
corpsource = "IBM Data Syst. Div., Eng./Sci. Comput. Center,
Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; APL2; arrays; bases; Bases; Boolean; Boolean
arrays; Boolean functions; decision support systems;
Decision support systems; dispatching; expert systems;
FABA; fact tables; Fact tables; functional; Functional
mapping; knowledge engineering; knowledge
representation and manipulation; Knowledge
representation and manipulation; knowledge-based expert
system; Knowledge-based expert system; manufacturing
dispatch application; Manufacturing dispatch
application; mapping; procedure modules; Procedure
modules; semiconductor facility; Semiconductor
facility",
thesaurus = "APL; Boolean functions; Decision support systems;
Dispatching; Expert systems; Knowledge engineering",
treatment = "A Application; P Practical",
}
@Article{Stapper:1989:FPI,
author = "C. H. Stapper",
title = "Fault-simulation programs for integrated-circuit yield
estimations",
journal = j-IBM-JRD,
volume = "33",
number = "6",
pages = "647--652",
month = nov,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Three programs are described here which have been used
for integrated-circuit yield modeling at the IBM
facility in Essex Junction, Vermont. The first program
generates negative binomial distributions which are
used to represent the frequency distribution of the
number of faults per chip. Calculations with the
generalized combination function A ! B in APL are
limited to simulations of up to 99999 faults, and can
take too much computer time to run. These limitations
are eliminated when the calculations make use of the
scan function. The second program simulates clustered
fault locations on a map. The clusters are initially
generated using a radial Gaussian probability
distribution. Each fault location is stored as a
complex number, which facilitates the use of
cluster-shaping programs that are also described. In a
third program, another simulator of fault maps faults
are added as a function of time. This program also
results in fault distributions that are clustered. In
addition, it produces frequency distributions that very
closely approximate negative binomial distributions.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B1130B (Computer-aided
circuit analysis and design); C7410D (Electronic
engineering)",
classification = "B1130B (Computer-aided circuit analysis and design);
B1265 (Digital electronics); C7410D (Electronic
engineering)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; APL listings; binomial distributions;
cluster-shaping programs; Cluster-shaping programs;
clustered fault locations; Clustered fault locations;
digital; digital integrated circuits; distribution;
distributions; electronic engineering computing; fault;
Fault distributions; fault location; fault maps; Fault
maps; faults; Faults; frequency distribution; Frequency
distribution; generalized combination function;
Generalized combination function; IBM facility;
integrated-circuit yield estimations;
Integrated-circuit yield estimations; negative;
Negative binomial distributions; radial Gaussian
probability; Radial Gaussian probability distribution;
scan function; Scan function; simulation",
thesaurus = "APL listings; Digital integrated circuits; Digital
simulation; Electronic engineering computing; Fault
location",
treatment = "A Application; P Practical",
}
@Article{Donofrio:1990:P,
author = "N. M. Donofrio",
title = "Preface",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "2--3",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:42:18 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: ``The IBM RISC System\slash 6000
processor''.",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401B.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cocke:1990:ERT,
author = "John Cocke and Victoria Markstein",
title = "The evolution of {RISC} technology at {IBM}",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "4--11",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401C.pdf",
abstract = "The paper traces the evolution of IBM RISC
architecture from its origins in the 1970s at the IBM
Thomas J Watson Research Center to the present-day IBM
RISC System/6000 computer. The acronym RISC (reduced
instruction-set computer) is used to describe the 801
and subsequent architectures. However, RISC in this
context does not strictly imply a reduced number of
instructions, but rather a set of primitives carefully
chosen to exploit the fastest component of the storage
hierarchy and provide instructions that can be
generated easily by compilers. The paper describes how
these goals were embodied in the 801 architecture and
how they have since evolved on the basis of experience
and new technologies. The effect of this evolution is
illustrated with the results of several benchmark tests
of CPU performance.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture)",
classification = "C5220 (Computer architecture)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1970S; 1970s; 801 Architecture; 801 architecture;
Benchmark tests; benchmark tests; Center; Compilers;
compilers; CPU; CPU performance; Fastest component;
fastest component; IBM computers; IBM RISC
architecture; IBM RISC System/6000 computer; IBM Thomas
J Watson Research; IBM Thomas J Watson Research Center;
performance; reduced instruction set computing; reduced
instruction-; Reduced instruction-set computer; set
computer; storage hierarchy; Storage hierarchy",
thesaurus = "IBM computers; Reduced instruction set computing",
treatment = "G General Review; P Practical",
}
@Article{Bakoglu:1990:IRS,
author = "H. B. Bakoglu and G. F. Grohoski and R. K. Montoye",
title = "The {IBM RISC System}\slash 6000 processor: Hardware
overview",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "12--22",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401D.pdf",
abstract = "A highly concurrent superscalar second-generation
family of RISC workstations and servers is described.
The RISC System\slash 6000 family is based on the new
IBM POWER (performance optimization with enhanced RISC)
architecture; the hardware implementation takes
advantage of this powerful RISC architecture and
employs sophisticated design techniques to achieve a
short cycle time and a low cycles-per-instruction (CPI)
ratio. The RS\slash 6000 CPU features
multiple-instruction dispatch, multiple functional
units that operate concurrently, separate instruction
and data caches, and zero-cycle branches. In this
superscalar implementation, at a given cycle the
equivalent of five operations can be executed
simultaneously (a branch, a condition-register
operation, and a floating-point multiply-add). The
RS\slash 6000 family supports the IBM Micro Channel
architecture as well as high-speed serial optical links
to provide a high-bandwidth I/O subsystem.",
acknowledgement = ack-nhfb,
affiliation = "IBM Adv. Workstations Div., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C5220
(Computer architecture)",
classification = "C5220 (Computer architecture); C5440 (Multiprocessor
systems and techniques)",
corpsource = "IBM Adv. Workstations Div., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architecture; branch; Branch; caches; concurrent
superscalar second-generation family; Concurrent
superscalar second-generation family;
condition-register; Condition-register operation; CPI
ratio; Cycle time; cycle time; cycles-per-instruction;
Cycles-per-instruction ratio; data; Data caches;
floating-point multiply-add; Floating-point
multiply-add; high-bandwidth I/O; High-bandwidth I/O
subsystem; High-bandwidth I/O subsystem, RISC servers;
IBM computers; IBM Micro Channel; IBM Micro Channel
architecture; IBM POWER architecture; IBM RISC
System/6000; IBM RISC System/6000 processor; IBM RISC
System\slash 6000 processor; instruction caches;
Instruction caches; instruction dispatch; Multiple
functional units; multiple functional units; multiple-;
Multiple-instruction dispatch; multiprocessing systems;
operation; performance optimization with enhanced;
Performance optimization with enhanced RISC; processor;
ratio; reduced instruction; RISC; RISC architecture;
RISC servers; RISC workstations; RS/6000 CPU; RS\slash
6000 CPU; serial optical links; Serial optical links;
set computing; subsystem; zero-cycle branches;
Zero-cycle branches",
thesaurus = "IBM computers; Multiprocessing systems; Reduced
instruction set computing",
treatment = "P Practical",
}
@Article{Oehler:1990:IRS,
author = "R. R. Oehler and R. D. Groves",
title = "{IBM RISC System}\slash 6000 processor architecture",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "23--36",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401E.pdf",
abstract = "Describes the hardware architecture of the IBM RISC
System\slash 6000 processor, which combines basic RISC
principles with a partitioning of registers by function
into multiple ALUs. This allows a high degree of
parallelism in execution and permits a compiler to
generate highly optimized code to manage the
interaction among parallel functions. Floating-point
arithmetic is integrated into the architecture, and
floating-point performance is comparable to that of
many vector processors.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C6140B
(Machine-oriented languages)",
classification = "C5220 (Computer architecture); C6140B
(Machine-oriented languages)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arithmetic; Compiler; compiler; floating-point;
Floating-point arithmetic; Floating-point performance;
floating-point performance; Floating-point performance,
Register partition; IBM computers; IBM RISC System/6000
processor architecture; IBM RISC System\slash 6000
processor architecture; interaction management;
Interaction management; Multiple ALUs; multiple ALUs;
optimized code; Optimized code; parallel functions;
Parallel functions; Parallelism; parallelism; reduced
instruction set computing; Register partition; register
partition",
thesaurus = "IBM computers; Reduced instruction set computing",
treatment = "P Practical",
}
@Article{Grohoski:1990:MOI,
author = "G. F. Grohoski",
title = "Machine organization of the {IBM RISC System}\slash
6000 processor",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "37--58",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401F.pdf",
abstract = "The IBM RISC System\slash 6000 processor is
second-generation RISC processor which reduces the
execution pipeline penalties caused by branch
instructions and also provides high floating-point
performance. It employs multiple functional units which
operate concurrently to maximize the instruction
execution rate. By employing these advanced
machine-organization techniques, it can execute up to
four instructions simultaneously. Approximately 11
MFLOPS are achieved on the LINPACK benchmarks.",
acknowledgement = ack-nhfb,
affiliation = "IBM Adv. Workstations Div., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C6140B
(Machine-oriented languages)",
classification = "C5220 (Computer architecture); C6140B
(Machine-oriented languages)",
corpsource = "IBM Adv. Workstations Div., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "11 MFLOPS; 11 MFLOPS, Machine organization; branch
instructions; Branch instructions; Concurrent
operation; concurrent operation; Execution pipeline
penalties; execution pipeline penalties; floating-point
performance; high; High floating-point performance; IBM
computers; IBM RISC; IBM RISC System/6000 processor;
IBM RISC System\slash 6000 processor; instruction
execution rate; Instruction execution rate; LINPACK
benchmarks; machine organization; Machine organization;
machine-organization; Machine-organization techniques;
Maximize; maximize; multiple functional units; Multiple
functional units; reduced instruction set computing;
Second-generation RISC processor; second-generation
RISC processor; System/6000 processor; techniques",
numericalindex = "Computer speed 1.1E+07 FLOPS",
thesaurus = "IBM computers; Reduced instruction set computing",
treatment = "P Practical",
}
@Article{Montoye:1990:DIR,
author = "R. K. Montoye and E. Hokenek and S. L. Runyon",
title = "Design of the {IBM RISC System\slash 6000}
floating-point execution unit",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "59--70",
month = jan,
year = "1990",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.341.0059",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401G.pdf",
abstract = "The IBM RISC System\slash 6000 (RS\slash 6000)
floating-point unit (FPU) exemplifies a
second-generation RISC CPU architecture and an
implementation which greatly increases floating-point
performance and accuracy. The key feature of the FPU is
a unified floating-point multiply-add-fused unit (MAF)
which performs the accumulate operation (A*B)+C as an
indivisible operation. The paper first discusses the
motivation for MAF, explaining in some detail why it is
an appropriate addition to the floating-point
architecture in VLSI. A summary of floating-point
operations is then given, with a discussion to
demonstrate the parallelism that is possible when the
multiply and add are fused. This is followed by a
description of the two-stage pipeline used for the
version of IEEE double-precision floating-point
arithmetic used in the RS\slash 6000 processor, with
delays consistent with its over-all superscalar
second-generation RISC architecture. Then the paper
describes the interaction of logical and physical
design required to incorporate several advances in VLSI
arithmetic while accommodating required delay and
technological (physical) constraints. The results are
then summarized.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B1130B (Computer-aided
circuit analysis and design); B1265F (Microprocessors
and microcomputers); C5230 (Digital arithmetic
methods); C5220 (Computer architecture); C5210B
(Computer-aided logic design)C7410D (Electronic
engineering)",
classification = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); B1265F (Microprocessors and
microcomputers); C5210B (Computer-aided logic design);
C5220 (Computer architecture); C5230 (Digital
arithmetic methods); C7410D (Electronic engineering)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorrktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Accumulate operation; accumulate operation;
arithmetic; CAD; circuit layout CAD; digital
arithmetic; floating-point architecture; Floating-point
architecture; generation RISC CPU architecture; IBM
computers; IBM RISC System/6000 floating-point
execution unit; IBM RISC System\slash 6000
floating-point execution unit; IEEE double-precision
floating-point; IEEE double-precision floating-point
arithmetic; indivisible; Indivisible operation; logic;
multiply-add-fused unit; operation; Parallelism;
parallelism; reduced instruction set computing;
second-; Second-generation RISC CPU architecture; stage
pipeline; Superscalar second-generation RISC
architecture; superscalar second-generation RISC
architecture; two-; Two-stage pipeline; unified
floating-point; Unified floating-point
multiply-add-fused unit; VLSI arithmetic; VLSI
arithmetic, IBM RISC System/6000 floating-point
execution unit",
thesaurus = "Circuit layout CAD; Digital arithmetic; IBM computers;
Logic CAD; Reduced instruction set computing",
treatment = "P Practical",
}
@Article{Hokenek:1990:LZA,
author = "E. Hokenek and R. K. Montoye",
title = "Leading-zero anticipator ({LZA}) in the {IBM RISC
System\slash 6000} floating-point execution unit",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "71--77",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401H.pdf",
abstract = "Presents a novel technique used in the
multiply-add-fused (MAF) unit of the IBM RISC
System\slash 6000 (RS\slash 6000) processor for
normalizing the floating-point results. Unlike the
conventional procedures applied thus far, the so-called
leading-zero anticipator (LZA) of the RS\slash 6000
carries out processing of the leading zeros and ones in
parallel with floating-point addition. Therefore, the
new circuitry reduces the total latency of the MAF unit
by enabling the normalization and addition to take
place in a single cycle.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5230 (Digital arithmetic
methods)",
classification = "B1265B (Logic circuits); C5230 (Digital arithmetic
methods)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "add-fused; Circuitry; circuitry; computing; digital
arithmetic; floating-; Floating-point addition; IBM
computers; IBM RISC System/6000 floating-point
execution unit; IBM RISC System\slash 6000
floating-point execution unit; Latency; latency;
Leading-zero anticipator; leading-zero anticipator;
multiply-; Multiply-add-fused; Normalization;
normalization; Parallel; parallel; point addition;
reduced instruction set",
thesaurus = "Digital arithmetic; IBM computers; Reduced instruction
set computing",
treatment = "P Practical",
}
@Article{Ratiu:1990:PBS,
author = "I. M. Ratiu and H. B. Bakoglu",
title = "Pseudorandom built-in self-test methodology and
implementation for the {IBM RISC System}\slash 6000
processor",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "78--84",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401I.pdf",
abstract = "The paper describes a unified self-test and system
bring-up methodology. The components involved include a
common on-chip processor (COP) that executes the chip
self-test sequence and provides an interface to the COP
bus, a serial bus (COP bus) that links the chips to OCS
and ESP, an on-card sequencer (OCS) that controls the
self-test and system initialization sequences, and an
engineering support processor (ESP) that is used for
system verification, bring-up, and debug. Almost all
RISC System/6000 chips contain embedded RAMs such as
register files, caches, and directories; therefore, the
self-test methodology described is particularly
suitable for logic chips that contain embedded arrays.
Logic and RAM self-test is executed by a control
processor (COP) integrated on the chips. The COP
controls the self-test sequence, generates pseudorandom
test vectors, scans them into chip registers, and
provides the select lines that establish a one-to-one
correspondence between RAM input/output and chip
registers.",
acknowledgement = ack-nhfb,
affiliation = "IBM Adv. Workstations Div., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); B1265F (Microprocessors and
microcomputers); B0170E (Production facilities and
engineering); C5470 (Performance evaluation and
testing); C7410H (Instrumentation)",
classification = "B0170E (Production facilities and engineering);
B1265B (Logic circuits); B1265F (Microprocessors and
microcomputers); B2570 (Semiconductor integrated
circuits); C5470 (Performance evaluation and testing);
C7410H (Instrumentation)",
corpsource = "IBM Adv. Workstations Div., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic testing; caches; Caches; chip processor;
chip registers; Chip registers; chip self-test
sequence; Chip self-test sequence; common on-; Common
on-chip processor; computer testing; control; Control
processor; COP bus; debug; Debug; directories;
Directories; embedded arrays; Embedded arrays; embedded
RAMs; Embedded RAMs; engineering support processor;
Engineering support processor; ESP; IBM computers; IBM
RISC System/6000; IBM RISC System/6000 processor;
initialization; instruction set computing; integrated
circuit testing; interface; Interface; lines; logic
chips; Logic chips; logic testing; OCS; on-card
sequencer; On-card sequencer; processor; pseudorandom
built-in self-test; Pseudorandom built-in self-test;
pseudorandom test vectors; Pseudorandom test vectors;
reduced; register files; Register files; select; Select
lines; serial bus; Serial bus; system; system bring-up;
System bring-up; System initialization; System
verification; unified self-test; Unified self-test;
verification",
thesaurus = "Automatic testing; Computer testing; IBM computers;
Integrated circuit testing; Logic testing; Reduced
instruction set computing",
treatment = "P Practical",
}
@Article{Warran:1990:ISI,
author = "H. S. {Warran, Jr.}",
title = "Instruction scheduling for the {IBM RISC System\slash
6000} processor",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "85--92",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401J.pdf",
abstract = "For fast execution on the IBM RISC System/6000
processor, instructions should be arranged in an order
that uses the arithmetic units as efficient as
possible. The paper describes the scheduling
requirements of the machine, and a scheduling algorithm
for it that is used in two compilers.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other processors);
C6110 (Systems analysis and programming)",
classification = "C6110 (Systems analysis and programming); C6150C
(Compilers, interpreters and other processors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arithmetic units; Arithmetic units; compilers;
Compilers; IBM computers; IBM RISC System/6000
processor; instruction scheduling; Instruction
scheduling; parallel programming; program compilers;
reduced instruction set computing; scheduling;
scheduling algorithm; Scheduling algorithm",
thesaurus = "IBM computers; Parallel programming; Program
compilers; Reduced instruction set computing;
Scheduling",
treatment = "P Practical",
}
@Article{Golumbic:1990:ISB,
author = "M. C. Golumbic and V. Rainish",
title = "Instruction scheduling beyond basic blocks",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "93--97",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401K.pdf",
abstract = "Instruction scheduling consists of the rearrangement
or transformation of program statements, usually at the
intermediate language or assembly code level, in order
to reduce possible run-time delays between
instructions. Such transformations must preserve data
dependency and are subject to other constraints. Highly
optimizing compilers employing instruction-scheduling
techniques have proven to be effective in improving the
performance of pipeline processors. Considerable
attention has been given to scheduling code within the
scope of basic blocks. The paper presents techniques
for scheduling beyond basic blocks. This allows a
further reduction in run-time delays such as those due,
e.g. to branches and loops, enabling the exploiting of
pipeline architectures which would not otherwise be
possible.",
acknowledgement = ack-nhfb,
affiliation = "IBM Israel Sci. and Technol. Center, Haifa, Israel",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other processors);
C6110 (Systems analysis and programming)",
classification = "C6110 (Systems analysis and programming); C6150C
(Compilers, interpreters and other processors)",
corpsource = "IBM Israel Sci. and Technol. Center, Haifa, Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Assembly code; assembly code; Compilers; compilers;
constraints; Constraints; data; Data dependency;
dependency; IBM computers; Instruction-scheduling;
instruction-scheduling; Intermediate language;
intermediate language; parallel programming; Pipeline
architectures; pipeline architectures; pipeline
processors; Pipeline processors; program compilers;
program statements; Program statements; Rearrangement;
rearrangement; reduced instruction set computing;
run-time delays; Run-time delays; scheduling;
transformation; Transformation",
thesaurus = "IBM computers; Parallel programming; Program
compilers; Reduced instruction set computing;
Scheduling",
treatment = "P Practical",
}
@Article{Auslander:1990:MPL,
author = "M. A. Auslander",
title = "Managing programs and libraries in {AIX} Version 3 for
{RISC System\slash 6000} processors",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "98--104",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401L.pdf",
abstract = "The paper describes the program and program-library
management facility that has been developed for the AIX
operating system, Version 3, as implemented for the IBM
POWER architecture. It provides run-time loading of
libraries, symbol resolution with type checking, and
relocation. In addition, the use of the loader to add
programs to an already running process or to the kernel
is offered. The advantages of these functions and the
techniques needed to provide a usable and efficient
realization are described. Particular attention is
given to the special problems posed by very large
programs, and by very small programs which use services
from very large libraries.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems)",
classification = "C6150J (Operating systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AIX operating system; AIX Version 3; IBM computers;
IBM POWER architecture; instruction set computing;
management; operating systems (computers);
program-library; Program-library management; reduced;
RISC System/6000 processors; Run-time loading; run-time
loading; Symbol resolution; symbol resolution; Type
checking; type checking",
thesaurus = "IBM computers; Operating systems [computers]; Reduced
instruction set computing",
treatment = "P Practical",
}
@Article{Chang:1990:ESF,
author = "A. Chang and M. F. Mergen and R. K. Rader and J. A.
Roberts and S. L. Porter",
title = "Evolution of storage facilities in {AIX} Version 3 for
{RISC System\slash 6000} processors",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "105--110",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401M.pdf",
abstract = "The AIX Version 3 storage facilities include features
not found in other implementations of the UNIX
operating system. Maximum virtual memory is more than
1000 terabytes and is used pervasively to access all
files and the meta-data of the file systems. Each
separate file system (subtree) of the file name
hierarchy occupies a logical disk volume, composed of
space from possibly several disks. Database memory (a
variant of virtual memory) and other database
techniques are used to manage file system meta-data.
These features provide the capacity to address large
applications and many users, simplified program access
to file data, efficient file buffering in memory,
flexible management of disk space, and reliable file
systems with short restart time.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems); C6120 (File
organisation)",
classification = "C6120 (File organisation); C6150J (Operating
systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(computers); AIX Version 3; AIX Version 3 storage
facilities; buffering; database memory; Database
memory; disk space; Disk space; file; File buffering;
file data; File data; file name hierarchy; File name
hierarchy; file organisation; file systems; File
systems; flexible management; Flexible management; IBM
computers; logical disk volume; Logical disk volume;
meta-data; Meta-data; operating systems; program
access; Program access; reduced instruction set
computing; reliable file; Reliable file systems;
restart time; Restart time; RISC System/6000
processors; storage; storage facilities; subtree;
Subtree; systems; UNIX operating system; virtual;
virtual memory; Virtual memory",
thesaurus = "File organisation; IBM computers; Operating systems
[computers]; Reduced instruction set computing; Virtual
storage",
treatment = "P Practical",
}
@Article{Markstein:1990:CEF,
author = "P. W. Markstein",
title = "Computation of elementary functions on the {IBM RISC
System\slash 6000} processor",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "111--119",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65-04 (65D20)",
MRnumber = "1 057 659",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401N.pdf",
abstract = "The additional speed and precision of the IBM RISC
System\slash 6000 floating-point unit have motivated
reexamination of algorithms to perform division, square
root, and the elementary functions. New results are
obtained which avoid the necessity of doing special
testing to get the last bit rounded correctly in
accordance with all of the IEEE rounding modes in the
case of division and square root. For the elementary
function library, a technique is described for always
getting the last bit rounded correctly in the selected
IEEE rounding mode.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5230 (Digital arithmetic methods)",
classification = "C5230 (Digital arithmetic methods)",
corpsource = "IBM Res. Div., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computing; digital arithmetic; division; Division;
elementary functions; Elementary functions;
floating-point unit; Floating-point unit; IBM
computers; IBM RISC System/6000 processor; IBM RISC
System\slash 6000 processor; IEEE rounding; IEEE
rounding modes; IEEE rounding modes, IBM RISC
System/6000 processor; modes; reduced instruction set;
square root; Square root",
thesaurus = "Digital arithmetic; IBM computers; Reduced instruction
set computing",
treatment = "P Practical",
}
@Article{Anonymous:1990:RPI,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "120--130",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:42:18 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401O.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1990:RIPa,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "34",
number = "1",
pages = "131--136",
month = jan,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:42:18 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/341/ibmrd3401P.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{May:1990:P,
author = "Paul G. May",
title = "Preface",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "139--140",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:11:26 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wiesenfeld:1990:ESH,
author = "J. M. Wiesenfeld",
title = "Electro-optic sampling of high-speed devices and
integrated circuits",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "141--161",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The operating speeds of the fastest electronic devices
and integrated circuits (ICs) have surpassed the
capabilities of conventional electronic measurement
instrumentation. Electro-optic sampling is an optical
probing technique which has ultrashort temporal
resolution and is capable of noninvasively probing ICs
at internal nodes. This technique is voltage-sensitive
because it relies upon the electric field produced by
the signal voltage on the device under test (DUT). The
electric field (and hence and voltage) can be sampled
because it produces birefringence in an electro-optic
crystal which changes the state of polarization of an
ultrashort-duration optical probe pulse that propagates
through the electro-optic crystal. The electro-optic
crystal is the substrate of the DUT for direct probing,
is a crystal on a separate test structure for hybrid
probing, and is a separate crystal placed above the DUT
for external probing. Temporal resolution below 1 ps
and a sensitivity below 0.1 mV/ square root Hz have
been demonstrated (though not in the same experiment).
The principles of electro-optic sampling are reviewed
in this paper. Selected applications for measurement of
high-speed waveforms in discrete devices and in ICs are
presented.",
acknowledgement = ack-nhfb,
affiliation = "AT and T Bell Labs., Holmdel, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B4150
(Electro-optical devices); B7230 (Sensing devices and
transducers)",
classification = "B2570 (Semiconductor integrated circuits); B4150
(Electro-optical devices); B7230 (Sensing devices and
transducers)",
corpsource = "AT and T Bell Labs., Holmdel, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Birefringence; birefringence; circuits; Electric
field; electric field; Electro-optic sampling;
electro-optic sampling; electro-optical devices;
Electronic devices; electronic devices; integrated;
integrated circuit testing; Integrated circuits;
Optical probing; optical probing; probes; semiconductor
device testing; Substrate; substrate; Ultrashort
temporal resolution; ultrashort temporal resolution",
thesaurus = "Electro-optical devices; Integrated circuit testing;
Probes; Semiconductor device testing",
treatment = "B Bibliography; P Practical; X Experimental",
}
@Article{Heinrich:1990:PNO,
author = "H. K. Heinrich",
title = "Picosecond noninvasive optical detection of internal
electrical signals in flip-chip-mounted silicon
integrated circuits",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "162--172",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper reviews the charge-sensing optical probing
system, and shows how it may be used to detect internal
current and voltage signals in flip-chip-mounted
silicon integrated circuits. Previously, researchers
have used this concept to detect both single-shot
200-MHz-bandwidth signals, without averaging, and
8-GHz-bandwidth stroboscopic signals. This system has a
high sensitivity: 145-nA/ square root Hz current
sensitivity in typical bipolar transistors, and
1.35-mV/ square root Hz voltage sensitivity in typical
CMOS circuits (using a semiconductor laser probe). It
is noninvasive, has a potential submicron spatial
resolution, and should be capable of providing linear
and calibrated measurements. Therefore, this probing
approach should be a powerful tool for future circuit
analysis and testing.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B2220J
(Hybrid integrated circuits); B7230 (Sensing devices
and transducers)B0170E (Production facilities and
engineering)",
classification = "B0170E (Production facilities and engineering);
B2220J (Hybrid integrated circuits); B2570
(Semiconductor integrated circuits); B7230 (Sensing
devices and transducers)",
corpsource = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bipolar transistors; bipolar transistors; calibrated;
Calibrated measurements; charge-sensing optical
probing; Charge-sensing optical probing system; Circuit
analysis; circuit analysis; circuit testing; circuits;
CMOS; CMOS circuits; Current sensitivity; current
sensitivity; flip-chip devices; flip-chip-mounted;
Flip-chip-mounted silicon integrated circuits;
high-speed optical techniques; integrated; Internal
electrical signals; internal electrical signals;
linear; Linear measurements; measurements; monolithic
integrated circuits; Picosecond noninvasive optical
detection; picosecond noninvasive optical detection;
probes; silicon integrated circuits; Submicron spatial
resolution; submicron spatial resolution; system",
thesaurus = "Flip-chip devices; High-speed optical techniques;
Integrated circuit testing; Monolithic integrated
circuits; Probes",
treatment = "P Practical; X Experimental",
}
@Article{Clauberg:1990:PPP,
author = "R. Clauberg and H. Beha and A. Blacha and H. K.
Seitz",
title = "Picosecond photoemission probing of integrated
circuits: Capabilities, limitations, and applications",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "173--188",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The capabilities and limitations of the novel
photoemission probing technique for signal measurements
on internal nodes of VLSI integrated circuits are
reviewed with respect to the range of possible
applications of this method. Aspects such as voltage
sensitivity, time resolution, minimum accessible
feature size, sensitivity to perturbation effects, and
impact on the circuit under test are considered. It is
concluded that the especially high voltage sensitivity
of this new method opens the field of diagnostics of
circuits with ultrafast devices but partly low signal
repetition rates, which is not accessible by other
means. Such chips include, for example, complex logic
chips and special telecommunication chips.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Zurich Res. Lab., Ruschlikon,
Switzerland",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B2320
(Electron emission, materials and cathodes); B0170E
(Production facilities and engineering)",
classification = "B0170E (Production facilities and engineering);
B2320 (Electron emission, materials and cathodes);
B2570 (Semiconductor integrated circuits)",
corpsource = "Div. of IBM Res., Zurich Res. Lab., Ruschlikon,
Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "devices; effects; integrated circuit testing;
Integrated circuits; integrated circuits; Minimum
accessible feature size; minimum accessible feature
size; perturbation; Perturbation effects;
photoemission; photoemissive; Picosecond photoemission
probing; picosecond photoemission probing; probes;
resolution; Signal measurements; signal measurements;
time; Time resolution; VLSI; Voltage sensitivity;
voltage sensitivity",
thesaurus = "Integrated circuit testing; Photoemission;
Photoemissive devices; Probes; VLSI",
treatment = "P Practical; X Experimental",
}
@Article{Winkler:1990:FPP,
author = "D. Winkler and R. Schmitt and M. Brunner and B.
Lischke",
title = "Flexible picosecond probing of integrated circuits
with chopped electron beams",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "189--203",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The effective design and evaluation of high-speed
integrated circuits is supported by internal
noninvasive voltage-measurement techniques with
picosecond time resolution. An electron-beam tester has
therefore been developed which approaches the
theoretical time-resolution limit of this method. It is
based on the well-established e-beam technique for VLSI
circuits, allowing for high flexibility in driving
different kinds of high-frequency circuits under both
conventional and critical conditions. The electron
pulses of the stroboscopic test system are generated by
a two-stage chopping system which was optimized to
obtain very short pulses. It allows for a 7-ps
effective pulse width which simultaneously yields a
probe diameter of 0.5$\mu$m and a probe current of 1
nA. This current results in a noise voltage of 20 mV
when one period of a 1-GHz signal is recorded, with a
total acquisition time of 0.1 s. Long-range phase
shifting with high resolution is achieved by operating
the upper stage of the blanking system at a high
frequency and using the lower one as a selective gate.
This allows propagation-delay measurements to be
performed with a resolution of better than 2 ps over a
range of several $\mu$s.",
acknowledgement = ack-nhfb,
affiliation = "Siemens Res. Labs., Munich, West Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B7230
(Sensing devices and transducers); B0170E (Production
facilities and engineering)",
classification = "B0170E (Production facilities and engineering);
B2570 (Semiconductor integrated circuits); B7230
(Sensing devices and transducers)",
corpsource = "Siemens Res. Labs., Munich, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.5 Micron; 0.5 micron; 1 GHz; 1 NA; 1 nA; 20; 20 MV;
chopped; Chopped electron beams; circuit testing;
electron; electron beam applications; electron beams;
electron probes; Electron pulses; Electron-beam tester;
electron-beam tester; Flexible picosecond probing;
flexible picosecond probing; integrated; Integrated
circuits; integrated circuits; mV; Noninvasive
voltage-measurement techniques; noninvasive
voltage-measurement techniques; Propagation-delay
measurements; propagation-delay measurements; pulses;
Stroboscopic test system; stroboscopic test system;
Time-resolution limit; time-resolution limit; Two-stage
chopping system; two-stage chopping system; VLSI",
numericalindex = "Size 5.0E-07 m; Frequency 1.0E+09 Hz; Current
1.0E-09 A; Voltage 2.0E-02 V",
thesaurus = "Electron beam applications; Electron probes;
Integrated circuit testing; VLSI",
treatment = "P Practical; X Experimental",
}
@Article{May:1990:PPM,
author = "P. May and Y. Pastol and J.-M. Halbout and G. Chiu",
title = "Picosecond photoelectron microscope for high-speed
testing of integrated circuits",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "204--214",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The performance of devices and circuits is advancing
at a rapid pace with the advent of submicron design
ground rules and switching times under 50 ps. The
requirements for probing the internal nodes of these
ulta-fast, -small, and -dense circuits give rise to
great challenges for high-speed electron-beam testing.
The authors review the steps which have allowed
electron-beam testing to achieve simultaneously 5-ps
temporal resolution, 0.1-$\mu$m spot size, and 3 mV/
square root Hz voltage sensitivity. The resulting newly
developed instrument, called the picosecond
photoelectron scanning electron microscope (PPSEM), is
capable of measuring the state-of-the-art bipolar and
FET circuits and also VLSI passive interconnects.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B2390
(Electron and ion microscopes); B0170E (Production
facilities and engineering)",
classification = "B0170E (Production facilities and engineering);
B2390 (Electron and ion microscopes); B2570
(Semiconductor integrated circuits)",
corpsource = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bipolar circuits; bipolar circuits; circuit testing;
electron beam applications; electron microscopes;
electron probes; electron-beam; Electron-beam testing;
FET circuits; high-; High-speed testing; integrated;
Integrated circuits; integrated circuits;
interconnects; photoelectron spectroscopy; picosecond
photoelectron; Picosecond photoelectron microscope;
picosecond photoelectron microscope; Picosecond
photoelectron scanning electron microscope; Probing;
probing; scanning; scanning electron microscope; speed
testing; Temporal resolution; temporal resolution;
testing; VLSI; VLSI passive; VLSI passive
interconnects",
thesaurus = "Electron beam applications; Electron probes;
Integrated circuit testing; Photoelectron spectroscopy;
Scanning electron microscopes; VLSI",
treatment = "P Practical; X Experimental",
}
@Article{Fox:1990:SET,
author = "F. Fox and J. Kolzer and J. Otto and E. Plies",
title = "A submicron electron-beam tester for {VLSI} circuits
beyond the {4-Mb DRAM}",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "215--226",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper describes the electron-optical low-voltage
column of the submicron electron-beam tester. It can be
used to produce an electron probe of 0.12-$\mu$m
diameter, 2.5-nA probe current, and 1-kV beam voltage.
It is shown that in the case of waveform measurements
on 1.1-$\mu$m interconnection lines, the crosstalk is
only approximately 3\%. The voltage resolution is
sufficient to allow the sense signal of a 4-Mb DRAM
(dynamic random access memory) to be measured. Further
internal measurements with the electron probe for the
chip verification of the 4-Mb DRAM are also shown which
demonstrate the flexibility and the benefits of
electron-beam testing. On the basis of the measured
performance data and its successful use in the circuit
analysis of the 4-Mb DRAM, the submicron electron-beam
tester appears to be suitable also for VLSI circuits
with reduced design rules, e.g., for the 16-Mb DRAM.
The improvements required for such future applications
are briefly discussed.",
acknowledgement = ack-nhfb,
affiliation = "Siemens Res. Labs., Munich, West Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B1265D
(Memory circuits); B0170E (Production facilities and
engineering); C5320G (Semiconductor storage)",
classification = "B0170E (Production facilities and engineering);
B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits); C5320G (Semiconductor storage)",
corpsource = "Siemens Res. Labs., Munich, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.12; 0.12 Micron; 1 KV; 1 kV; 2.5 NA; 2.5 nA; 4 Mbit;
4-Mb DRAM; circuit testing; Dynamic random access
memory; dynamic random access memory; electron beam
applications; Electron probe; electron probe; electron
probes; Electron-optical low-voltage column;
electron-optical low-voltage column; integrated;
integrated memory circuits; micron; random-access;
storage; Submicron electron-beam tester; submicron
electron-beam tester; VLSI; VLSI circuits; Waveform
measurements; waveform measurements",
numericalindex = "Size 1.2E-07 m; Current 2.5E-09 A; Voltage 1.0E+03
V; Storage capacity 4.2E+06 bit",
thesaurus = "Electron beam applications; Electron probes;
Integrated circuit testing; Integrated memory circuits;
Random-access storage; VLSI",
treatment = "P Practical",
}
@Article{Restle:1990:IPS,
author = "Phillip Restle and Antonio Gnudi",
title = "Internal probing of submicron {FETs} and photoemission
using individual oxide traps",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "227--242",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In submicron field-effect transistors with channel
area less than 0.5$\mu$m/sup 2/, the capture or
emission of a single electron (or hole) in the gate
oxide has an easily observable effect on the device
resistance. Measurements are described in which the
time and amplitude of the resistance change due to each
capture and emission event from an individual trap are
extracted to obtain the average capture and emission
times, and the amplitude of the resistance change, at
different temperatures, device biases, and light
intensities. Techniques are described for using the
data at different biases to characterize the trap, find
the location of the trap in the device, and then use
the trap as a probe of the oxide field (or surface
potential) and the surface charge density within a
5-50-AA radius of the trap. In some devices a single
trap can be resolved over almost all designed bias
regions of the FET near room temperature. In effect,
individual traps can be used as internal probes into
VLSI devices of the present and future. Results from 2D
computer device modeling of these devices are used to
evaluate and understand these techniques. Methods for
applying these techniques to the study of device
degradation are discussed. Data are presented in which
photoemission is observed from a single electron
trap.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); B2560B (Modelling
and equivalent circuits)",
classification = "B2560B (Modelling and equivalent circuits); B2560S
(Other field effect devices)",
corpsource = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2D computer device modeling; Device biases; device
biases; Device resistance; device resistance; device
testing; electron probes; Electron trap; electron trap;
electron traps; field effect transistors; Internal
probing; internal probing; Light intensities; light
intensities; oxide; Oxide traps; Photoemission;
photoemission; semiconductor; semiconductor device
models; Submicron FETs; submicron FETs; Surface charge
density; surface charge density; traps",
thesaurus = "Electron probes; Electron traps; Field effect
transistors; Photoemission; Semiconductor device
models; Semiconductor device testing",
treatment = "P Practical; X Experimental",
}
@Article{El-Kareh:1990:SMP,
author = "B. El-Kareh and W. R. Tonti and S. L. Titcomb",
title = "A submicron {MOSFET} parameter extraction technique",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "243--249",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A technique is introduced for measuring electron and
hole mobilities as a function of temperature and normal
field in inverted silicon surfaces. The authors also
introduce a new definition of threshold voltage which
allows the method to measure mobility independent of
channel dimensions and resistance in series with the
channel. The results are used to extract the resistance
in series with the channel, the effective channel
dimensions, and the intrinsic MOSFET transconductance.
The technique is demonstrated on MOSFETs with channel
lengths ranging from 0.25$\mu$m to 20$\mu$m.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/sur Si/el",
classcodes = "B2560R (Insulated gate field effect transistors);
B2560B (Modelling and equivalent circuits); B7310
(Electric and magnetic variables)",
classification = "B2560B (Modelling and equivalent circuits); B2560R
(Insulated gate field effect transistors); B7310
(Electric and magnetic variables)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.25 micron to 20 micron; 0.25 Micron to 20 micron;
carrier mobility; channel dimensions; Channel
dimensions; electric variables measurement; electron
mobilities; Electron mobilities; gate field effect
transistors; hole mobilities; Hole mobilities;
insulated; inverted silicon surfaces; Inverted silicon
surfaces; semiconductor device models; Si surface;
submicron MOSFET parameter extraction; Submicron MOSFET
parameter extraction technique; technique; threshold
voltage; Threshold voltage; transconductance;
Transconductance",
numericalindex = "Size 2.5E-07 to 2.0E-05 m",
thesaurus = "Carrier mobility; Electric variables measurement;
Insulated gate field effect transistors; Semiconductor
device models",
treatment = "P Practical; X Experimental",
}
@Article{Golladay:1990:ETO,
author = "S. D. Golladay and N. A. Wagner and J. R. Rudert and
R. N. Schmidt",
title = "Electron-beam technology for open\slash short testing
of multi-chip substrates",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "250--259",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors discuss the need for noncontact electrical
testing of high-performance multi-chip substrates and
describe an electron-beam tester developed for this
application. They describe the operational principles
of the tester and compare and contrast its performance
with that of mechanical probe testers. Finally, they
discuss the motivations and technical issues involved
in extending the electron-beam test method to future
high-performance packages.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2220 (Integrated circuits); B0170E (Production
facilities and engineering); B2570 (Semiconductor
integrated circuits); B0170J (Product packaging)",
classification = "B0170E (Production facilities and engineering);
B0170J (Product packaging); B2220 (Integrated
circuits); B2570 (Semiconductor integrated circuits)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "electron beam applications; Electron beam technology;
electron beam technology; electron-beam; Electron-beam
tester; integrated circuit testing; Multichip
substrates; multichip substrates; Noncontact electrical
testing; noncontact electrical testing; open/short;
Open/short testing; Operational principles; operational
principles; packaging; substrates; tester; testing",
thesaurus = "Electron beam applications; Integrated circuit
testing; Packaging; Substrates",
treatment = "P Practical; X Experimental",
}
@Article{Rodriguez:1990:DUV,
author = "C. W. Rodriguez and D. E. Hoffman",
title = "The development of ultra-high-frequency {VLSI} device
test systems",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "260--275",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The development of test systems for high-performance
semiconductor logic and memory devices is discussed.
The capabilities of shared-resource and tester-per-pin
system architectures are reviewed. Test-system hardware
design to provide high-speed pin electronics and
generation of LSSD, weighted random, and algorithmic
patterns is described. The reasons for the selection of
the tester-per-pin system architecture are given in
terms of the way in which overall system accuracy and
test-system user flexibility are maximized for
differing test methodologies.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B1265B
(Logic circuits); B1265D (Memory circuits); B0170E
(Production facilities and engineering); B7210B
(Automatic test and measurement systems)",
classification = "B0170E (Production facilities and engineering);
B1265B (Logic circuits); B1265D (Memory circuits);
B2570 (Semiconductor integrated circuits); B7210B
(Automatic test and measurement systems)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Algorithmic patterns; algorithmic patterns; ATE;
automatic test equipment; electronics; integrated
circuit testing; integrated logic circuits; integrated
memory circuits; LSSD; Memory devices; memory devices;
pin; Pin electronics; Semiconductor logic;
semiconductor logic; Shared-resource; shared-resource;
Tester-per-pin system; tester-per-pin system; UHF VLSI
device test systems; VLSI; Weighted random; weighted
random",
thesaurus = "Automatic test equipment; Integrated circuit testing;
Integrated logic circuits; Integrated memory circuits;
VLSI",
treatment = "P Practical; X Experimental",
}
@Article{Vida-Torku:1990:TGV,
author = "E. K. Vida-Torku and J. A. Monzel and T. L. Bossis and
C. E. Radke and D. M. Wu",
title = "Test generation for {VLSI} chips with embedded
memories",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "276--288",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An effective approach for generating patterns for
testing memories embedded in logic is presented.
Through circuit testability analysis, which is a study
of the effect of process defects on memory circuits,
unique algorithms can be derived for testing the
memory. Circuit and logic designs for test features
that are required to make the pattern generation
process optimal are discussed. An analytical method is
described which assesses the performance
characteristics of the memory after functional test.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits); B1265B (Logic circuits); B0170E
(Production facilities and engineering); C5320G
(Semiconductor storage); C5210 (Logic design methods)",
classification = "B0170E (Production facilities and engineering);
B1265B (Logic circuits); B1265D (Memory circuits);
B2570 (Semiconductor integrated circuits); C5210 (Logic
design methods); C5320G (Semiconductor storage)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit; Circuit testability analysis; embedded
memories; Embedded memories; integrated circuit
testing; integrated memory circuits; logic design;
logic designs; Logic designs; pattern generation
process; Pattern generation process; performance
characteristics; Performance characteristics; process
defects; Process defects; test generation; Test
generation; testability analysis; VLSI; VLSI chips",
thesaurus = "Integrated circuit testing; Integrated memory
circuits; Logic design; VLSI",
treatment = "P Practical",
}
@Article{Huisman:1990:SEM,
author = "Leendert M. Huisman",
title = "Simulation of embedded memories by defective hashing",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "289--298",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Because logic designs are becoming more complex and
extensive, they increasingly tend to contain embedded
memories. In the simulation (particularly fault
simulation) of these designs, the embedded memories may
be found to require large amounts of storage unless a
carefully designed simulation strategy is adopted. This
paper describes a technique that drastically reduces
the storage required in the fault simulation of such
large designs. The required amount of storage can be
fixed at compile time or at load time, and can almost
always be made to fit in the available storage at the
cost of only a small decrease in the predicted exposure
probabilities.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B1265B (Logic circuits);
C5210 (Logic design methods); C5320G (Semiconductor
storage); C6120 (File organisation)",
classification = "B1265B (Logic circuits); B1265D (Memory circuits);
C5210 (Logic design methods); C5320G (Semiconductor
storage); C6120 (File organisation)",
corpsource = "Div. of IBM Res., Thomas J. Watson Res. Centre,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Defective hashing; defective hashing; Embedded
memories; embedded memories; fault; fault location;
Fault simulation; file organisation; logic; logic
design; Logic designs; logic designs; semiconductor
storage; simulation; testing",
thesaurus = "Fault location; File organisation; Logic design; Logic
testing; Semiconductor storage",
treatment = "P Practical",
}
@Article{Motika:1990:LCD,
author = "F. Motika and N. N. Tendolkar and C. C. Beh and W. R.
Heller and C. E. Radke and P. J. Nigh",
title = "A logic chip delay-test method based on system
timing",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "299--313",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors present a novel approach to delay-testing
of VLSI logic chips based on the level-sensitive scan
design (LSSD) methodology. The objective of the delay
test is to reduce significantly the failures of
multi-chip modules at system integration test while
minimizing the complexity and cost of subassembly
testing. Because system timing data are used to derive
test specifications, the delay defects that are most
likely to cause a system path failure are detected a
high percentage of the time. With the implementation of
the delay test in the wafer production line, the system
final-test failure rate of multi-chip modules used in
IBM mainframe machines has dropped significantly.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); B0170E (Production facilities and
engineering); C5210 (Logic design methods)",
classification = "B0170E (Production facilities and engineering);
B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210 (Logic design methods)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "delays; integrated logic circuits; level-;
Level-sensitive scan design; logic chip delay-test
method; Logic chip delay-test method; logic testing;
sensitive scan design; system integration test; System
integration test; system timing; System timing; VLSI",
thesaurus = "Delays; Integrated logic circuits; Logic testing;
VLSI",
treatment = "P Practical",
}
@Article{Wong:1990:ATS,
author = "R. C. Wong",
title = "An {AC} test structure for fast memory arrays",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "314--324",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An AC test structure (ACTS) built into fast memory
arrays is required to make them truly AC-testable, with
5-10\% timing accuracy. Since their AC performance is
very difficult to characterize, wafer tester timing
uncertainty is generally about 10-50\% of a typical
array access time. More accurate testers are complex
and expensive; they require long development time and
have complicated operation procedures. ACTS is a
simpler, cheaper, and more practical means of achieving
greater accuracy. An AC test structure is composed of a
tunable timer and path-shifting oscillators (PSOs)
built around the various access paths of the array. The
timer generates the array clocks with adjustable pulse
widths, and the PSOs transform time intervals into
frequencies. In the future, tester accuracy will
improve, but memory performance will have accelerated
even more. Thus, the need for ACTS is critical and will
remain so in the foreseeable future.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits); B0170E (Production facilities and
engineering); C5150 (Other circuits for digital
computers); C7410D (Electronic engineering)",
classification = "B0170E (Production facilities and engineering);
B1265D (Memory circuits); B2570 (Semiconductor
integrated circuits); C5150 (Other circuits for digital
computers); C7410D (Electronic engineering)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AC test structure; adjustable; Adjustable pulse
widths; array access time; Array access time; array
clocks; Array clocks; automatic testing; fast memory
arrays; Fast memory arrays; frequencies; Frequencies;
integrated; integrated circuit testing; memory
circuits; path-shifting oscillators; Path-shifting
oscillators; pulse widths; storage management chips;
time intervals; Time intervals; timer; timing accuracy;
Timing accuracy; tunable; Tunable timer; wafer tester
timing uncertainty; Wafer tester timing uncertainty",
thesaurus = "Automatic testing; Integrated circuit testing;
Integrated memory circuits; Storage management chips",
treatment = "P Practical",
}
@Article{Bula:1990:GDD,
author = "O. Bula and J. Moser and J. Trinko and M. Weissman and
F. Woytowich",
title = "Gross delay defect evaluation for a {CMOS} logic
design system product",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "325--338",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Randomly occurring gross delay defects allow chips to
pass full stuck-fault testing at both wafer and module
levels, but cause them to fail when operated at system
speeds. The paper describes the results of an
experiment designed to determine the actual delay
defect component of shipped product quality level
(SPQL) for a CMOS combination standard cell/gate array
design system. More than 60000 modules, representing
chips from the same IBM computer system, have been
delay-tested using the technique presented. The test
technique uses the stuck-fault patterns for a
level-sensitive scan design (LSSD) product. The
stuck-fault patterns are modified or `twisted'
according to specific algorithms to propagate
transitions through paths just prior to the output
measure. The patterns are applied at system speed
timings provided by the chip designers. Any gross delay
defect present in a tested path causes a fail. The
failing modules were characterized to determine the
size of the delay defects. Failure diagnostics were
performed on the defective modules. These were sent to
physical failure analysis for delayering, visual
verification, and electrical characterization. A
summary of physical defects which produced gross delay
defects is presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570D (CMOS integrated
circuits); C5210 (Logic design methods); C7410D
(Electronic engineering)",
classification = "B1265B (Logic circuits); B2570D (CMOS integrated
circuits); C5210 (Logic design methods); C7410D
(Electronic engineering)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; automatic testing; characterization; Chips;
chips; circuit testing; CMOS combination standard
cell/gate array design; CMOS combination standard
cell/gate array design system; CMOS integrated
circuits; CMOS logic; CMOS logic design system; Delay
defect component; delay defect component; Delay-tested;
delay-tested; Delayering; delayering; design system;
electrical; Electrical characterization; Failure
diagnostics; failure diagnostics; full stuck-fault;
Full stuck-fault testing; Gross delay defects; gross
delay defects; IBM computer system; integrated; level;
Level-sensitive scan design; level-sensitive scan
design; logic arrays; logic design; logic testing;
Module level; module level; Output measure; output
measure; patterns; Physical defects; physical defects;
physical failure; Physical failure analysis; shipped
product quality; Shipped product quality level;
stuck-fault; Stuck-fault patterns; system; System speed
timings; system speed timings; Tested path; tested
path; testing; Visual verification; visual
verification; Wafer level; wafer level",
thesaurus = "Automatic testing; CMOS integrated circuits;
Integrated circuit testing; Logic arrays; Logic design;
Logic testing",
treatment = "P Practical",
}
@Article{Bassett:1990:BDP,
author = "R. W. Bassett and M. E. Turner and J. H. Panner and P.
S. Gillis and S. F. Oakland and D. W. Stout",
title = "Boundary-scan design principles for efficient {LSSD
ASIC} testing",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "339--354",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A boundary-scan logic design method that depends only
on level-sensitive scan design (LSSD) principles has
been developed for IBM CMOS application-specific
integrated circuit (ASIC) products. This technique
permits comprehensive testing of LSSD ASICs with high
signal input/output pin counts, using relatively
inexpensive reduced-pin-count automatic test equipment
(ATE). The paper describes the LSSD logic structures
required, the reduced-pin-count testing and burn-in
processes used, and the ASIC product design decisions
that must be made to establish a consistent
boundary-scan implementation.",
acknowledgement = ack-nhfb,
affiliation = "IBM Syst. Tehnol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210 (Logic design methods)",
classification = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210 (Logic design methods)",
corpsource = "IBM Syst. Tehnol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits; ASIC product
design; Boundary-scan logic design; boundary-scan logic
design; Burn-in; burn-in; IBM CMOS
application-specific; IBM CMOS application-specific
integrated circuit; integrated circuit; level-;
Level-sensitive scan design; logic design; LSSD ASIC
testing; LSSD logic structures; pin-count automatic
test equipment; reduced-; Reduced-pin-count automatic
test equipment; sensitive scan design; Signal
input/output pin counts; signal input/output pin
counts; testing",
thesaurus = "Application specific integrated circuits; Integrated
circuit testing; Logic design",
treatment = "P Practical",
}
@Article{Starke:1990:DTD,
author = "Cordt W. Starke",
title = "Design for testability and diagnosis in a {VLSI CMOS
System\slash 370} processor",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "355--362",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Describes the design for testability and diagnosis in
an IBM System/370 processor based on VLSI CMOS
technology. The design incorporates built-in
pseudorandom-pattern self-test and the boundary-scan
technique. This technique permits the migration of
tests generated for component-level to higher-level
packages such as printed circuit boards and the system.
Consequently, the expense for testing of higher-level
packages can be reduced, and the test equipment for the
processor can be simplified. The design also offers
economical diagnostic capability.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Boeblingen, West Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1130B
(Computer-aided circuit analysis and design); B0170E
(Production facilities and engineering); C7410D
(Electronic engineering)",
classification = "B0170E (Production facilities and engineering);
B1130B (Computer-aided circuit analysis and design);
B2570D (CMOS integrated circuits); C7410D (Electronic
engineering)",
corpsource = "IBM Data Syst. Div., Boeblingen, West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic testing; Boundary-scan; boundary-scan;
built-in pseudorandom-; Built-in pseudorandom-pattern
self-test; circuit layout CAD; circuits; CMOS
integrated; Component-level; component-level; Design
for diagnosis; design for diagnosis; Design for
testability; design for testability; Economical
diagnostic capability; economical diagnostic
capability; higher-; Higher-level packages; IBM
computers; IBM System/370; IBM System/370 processor;
integrated circuit testing; level packages; pattern
self-test; Printed circuit boards; printed circuit
boards; processor; Test equipment; test equipment;
VLSI; VLSI CMOS technology",
thesaurus = "Automatic testing; Circuit layout CAD; CMOS integrated
circuits; IBM computers; Integrated circuit testing;
VLSI",
treatment = "P Practical",
}
@Article{Daehn:1990:AEL,
author = "W. Daehn and T. W. Williams and K. D. Wagner",
title = "Aliasing errors in linear automata used as
multiple-input signature analyzers",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "363--380 (or 363--379??)",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "94A29",
MRnumber = "92b:94027",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Deals with the aliasing probability of multiple-input
data compressors used in self-testing networks. It is
shown that a far more general class of linear machines
than linear feedback shift registers can be used for
data compression purposes. The function of these
machines is modeled by a Markov process. The
steady-state value of the aliasing probability is shown
to be the same as for single-input signature analysis
registers. An easily verifiable criterion is given that
allows one to decide whether a given linear machine
falls into this class of multiple-input data
compressors. The steady-state value of the aliasing
probability is shown to be independent of the
correlation of the data streams at the inputs of the
data compressor. Two kinds of circuits are analyzed in
more detail with respect to their aliasing properties:
linear feedback shift registers with multiple inputs,
and linear cellular automata. Simulation results show
the effect of the next-state function on the
steady-state value of the aliasing probability and the
effect of correlation on the transient response.",
acknowledgement = ack-nhfb,
affiliation = "Hannover Univ., West Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B0240Z (Other and
miscellaneous); B0290H (Linear algebra); C5210 (Logic
design methods); C4220 (Automata theory); C1140Z (Other
and miscellaneous); C4140 (Linear algebra)",
classification = "B0240Z (Other and miscellaneous); B0290H (Linear
algebra); B1265B (Logic circuits); C1140Z (Other and
miscellaneous); C4140 (Linear algebra); C4220 (Automata
theory); C5210 (Logic design methods)",
corpsource = "Hannover Univ., West Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebra; Aliasing errors; aliasing errors; Aliasing
probability; aliasing probability; Data compression;
data compression; finite automata; Linear cellular
automata; linear cellular automata; linear feedback
shift; Linear feedback shift registers; Linear
machines; linear machines; logic testing; Markov
process; Markov processes; matrix; Multiple-input data
compressors; multiple-input data compressors;
Multiple-input signature analyzers; multiple-input
signature analyzers; Next-state function; next-state
function; probability; registers; self-; Self-testing
networks; steady-state; Steady-state value; testing
networks; Transient response; transient response;
value",
reviewer = "Zhen Hua Wang",
thesaurus = "Finite automata; Logic testing; Markov processes;
Matrix algebra; Probability",
treatment = "P Practical; T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Savir:1990:ICA,
author = "J. Savir",
title = "Improved cutting algorithm",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "381--388",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The cutting algorithm allows computation of bounds on
signal probabilities and detection probabilities in
combinational networks. These bounds can be used to
determine the necessary pseudorandom test length needed
to test a network. One of the problems with the cutting
algorithm is that it may compute loose bounds which
translate into unnecessarily long test lengths. The
object of this paper is to improve the cutting
algorithm so that the computed bounds become
satisfactory. The improved cutting algorithm is a
careful combination of the original cutting algorithm
and the Parker-McCluskey algorithm. The tightness of
the computed bounds may vary depending on which portion
of the circuit is handled with the cutting algorithm
and which with the Parker-McCluskey algorithm. Thus,
the user of the improved cutting algorithm can actually
control and trade off the accuracy of the results
against the computational effort needed to achieve
them.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C4230B (Combinatorial switching
theory); C5120 (Logic and switching circuits); C7410D
(Electronic engineering)",
classification = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C4230B (Combinatorial switching
theory); C5120 (Logic and switching circuits); C7410D
(Electronic engineering)",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic testing; BIST; bounds; Combinational
networks; combinational networks; combinatorial
circuits; computed; Computed bounds; Cutting algorithm;
cutting algorithm; detection; Detection probabilities;
length; logic testing; Parker-McCluskey algorithm;
probabilities; probability; pseudorandom test;
Pseudorandom test length; Signal probabilities; signal
probabilities; Tightness; tightness",
thesaurus = "Automatic testing; Combinatorial circuits; Logic
testing; Probability",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Hortensius:1990:CAC,
author = "P. D. Hortensius and R. D. McLeod and B. W. Podaima",
title = "Cellular automata circuits for built-in self-test",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "389--405",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Results are presented for a variation on a built-in
self-test (BIST) technique based upon a distributed
pseudorandom number generator derived from a
one-dimensional cellular automata array. These cellular
automata logic block observation circuits provide an
alternative to conventional design for testability
circuitry. The issue of generating probabilistically
weighted test patterns for use in built-in self-test is
also addressed. The methodology presented considers the
suitability of incorporating structures based on
cellular automata, a strategy which, in general,
improves test pattern quality. Thus, these structures
qualify as attractive candidates for use in weighted
test pattern generator design. The analysis involved in
determining and statistically evaluating these
potential models is discussed, and is compared with
that for previous as well as statistically independent
models. Relevant signature analysis properties for
elementary one-dimensional cellular automata are also
discussed. It is found that cellular automata with
cyclic-group rules provide signature analysis
properties comparable to those of the linear feedback
shift register. The results presented are based upon
simulation.",
acknowledgement = ack-nhfb,
affiliation = "Div. of IBM Res., Thomas J Watson Res. Centre,
Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5120 (Logic and switching
circuits); C7410D (Electronic engineering); C4220
(Automata theory)",
classification = "B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C4220 (Automata theory); C5120
(Logic and switching circuits); C7410D (Electronic
engineering)",
corpsource = "Div. of IBM Res., Thomas J Watson Res. Centre,
Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automata; automata logic block observation circuits;
automatic testing; Built-in self-test; built-in
self-test; cellular; cellular arrays; Cellular automata
logic block observation circuits; circuitry;
Cyclic-group rules; cyclic-group rules; distributed
pseudorandom number; Distributed pseudorandom number
generator; finite automata; generator; integrated
circuit testing; one-dimensional cellular;
One-dimensional cellular automata; One-dimensional
cellular automata array; one-dimensional cellular
automata array; Probabilistically weighted test
patterns; probabilistically weighted test patterns;
Signature analysis properties; signature analysis
properties; Simulation; simulation; testability;
Testability circuitry",
thesaurus = "Automatic testing; Cellular arrays; Finite automata;
Integrated circuit testing",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Keller:1990:BSS,
author = "B. L. Keller and T. J. Snethen",
title = "Built-in self-test support in the {IBM Engineering
Design System}",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "406--415",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "To evaluate the effectiveness of built-in self-test
(BIST) for logic circuits, the test design automation
group within the IBM Engineering Design System (EDS)
has developed tools to support BIST. The paper is an
overview of that support. The specific hardware
approaches taken are described briefly, and a short
description is given of the major tools that have been
developed and the methodology for using them. The
performance of the system is shown for two sample
circuits.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5210 (Logic design
methods)",
classification = "B1265B (Logic circuits); C5210 (Logic design
methods)",
corpsource = "IBM Data Syst. Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic testing; Built-in self-test; built-in
self-test; circuits; IBM computers; IBM Engineering
Design System; logic; Logic circuits; logic testing;
Performance; performance; Test design automation group;
test design automation group; Tools; tools",
thesaurus = "Automatic testing; IBM computers; Logic testing",
treatment = "P Practical",
}
@Article{Oakland:1990:SAC,
author = "S. F. Oakland and J. L. Corr and J. D. Blair and R. D.
Norman and W. J. DeGuise",
title = "Self-testing the {16-Mbps} adapter chip for the {IBM}
token-ring local area network",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "416--427",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Describes the boundary-scan and built-in self-test
(BIST) functions of the IBM token-ring local area
network (LAN) adapter chip. These functions present a
number of unique features. First, less than 1\% of
available standard cell circuits were needed to
implement these functions. Second, clocking methods
used in different logical macros were merged into a
comprehensive clocking sequence for self-test. Finally,
asynchronous serial and parallel interfaces were
provided to facilitate the communication between a test
system and the chip's built-in test circuits. Although
self-test and boundary-scan provide for an inexpensive
higher-level package test, evaluation showed that
automatically generated deterministic patterns provide
a better-quality VLSI chip manufacturing test.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B2570D (CMOS
integrated circuits); B1265Z (Other digital circuits);
C5620L (Local area networks)",
classification = "B1265Z (Other digital circuits); B2570D (CMOS
integrated circuits); B6210L (Computer communications);
C5620L (Local area networks)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "16 Mbit/s; 16-Mbps adapter chip; asynchronous
parallel; Asynchronous parallel interface; Asynchronous
serial interface; asynchronous serial interface;
automatic testing; Automatically generated
deterministic patterns; automatically generated
deterministic patterns; Boundary scan function;
boundary scan function; Built-in self-test function;
built-in self-test function; Built-in test circuits;
built-in test circuits; Clocking methods; clocking
methods; Clocking sequence; clocking sequence; CMOS
integrated circuits; digital; IBM computers; IBM
token-ring local area; IBM token-ring local area
network; integrated circuit; integrated circuits;
interface; logical; Logical macros; macros;
manufacturing test; network; Standard cell circuits;
standard cell circuits; testing; token networks; VLSI
chip; VLSI chip manufacturing test",
numericalindex = "Bit rate 1.6E+07 bit/s",
thesaurus = "Automatic testing; CMOS integrated circuits; Digital
integrated circuits; IBM computers; Integrated circuit
testing; Token networks",
treatment = "P Practical",
}
@Article{VanHorn:1990:LIC,
author = "J. J. {Van Horn} and R. A. Waller and R. J. Prilik and
K. C. Bocash",
title = "{LAN} interface chip and mixed-signal testing
developments",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "428--441",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Describes the local area network semiconductor chip,
from early development through volume manufacturing
production, highlighting the testing achievements
associated with its qualification and release to
production. The paper deals with laboratory development
and production in manufacturing. It describes the
importance of partitioning via latch-based boundaries,
and how it reduced development cycle time by allowing
independent debug and diagnostic tests. The development
of tests to characterize the phase-lock loop at
application conditions and the evolution of these tests
into efficient production test vehicles are discussed.
Techniques are described that provide new approaches to
analog testing, focusing on adapting a production
digital tester to meet the characterization and
production requirements of a very sensitive
PLL/receiver/transmitter analog design. The discussion
on manufacturing is centered around three areas, wafer
testing, yield learning, and reliability. Unique
concepts in each area are presented, along with
detailed descriptions of specific applications.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B2570D (CMOS
integrated circuits); B0170E (Production facilities and
engineering); C5620L (Local area networks)",
classification = "B0170E (Production facilities and engineering);
B2570D (CMOS integrated circuits); B6210L (Computer
communications); C5620L (Local area networks)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analog testing; analog testing; Application
conditions; application conditions; area networks;
boundaries; CMOS integrated circuits; Independent debug
tests; independent debug tests; Independent diagnostic
tests; independent diagnostic tests; integrated circuit
testing; interface chip; Laboratory development;
laboratory development; LAN; LAN interface chip;
latch-based; Latch-based boundaries; local; local area
network; Local area network semiconductor chip;
Mixed-signal testing; mixed-signal testing;
Partitioning; partitioning; Phase-lock loop; phase-lock
loop; production digital; Production digital tester;
Production test vehicles; production test vehicles;
Reliability; reliability; semiconductor chip; tester;
Volume manufacturing production; volume manufacturing
production; Wafer testing; wafer testing; Yield
learning; yield learning",
thesaurus = "CMOS integrated circuits; Integrated circuit testing;
Local area networks",
treatment = "P Practical",
}
@Article{Anonymous:1990:RIPb,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "34",
number = "2/3",
pages = "442--448",
month = mar # "\slash " # may,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:11:49 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sai-Halasz:1990:ETP,
author = "G. A. Sai-Halasz and M. R. Wordeman and D. P. Kern and
S. A. Rishton and E. Ganin and T. H. P. Chang and R. H.
Dennard",
title = "Experimental technology and performance of
0.1-$\mu$m-gate-length {FETs} operated at
liquid-nitrogen temperature",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "452--465",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An overview is presented of work to explore the
extendibility of the silicon FET technology to the
0.1-$\mu$m-gate length level. Self-aligned, n-channel,
polysilicon-gated FETs were designed for operation at
77 K, with reduced power-supply voltage. Direct-write
electron-beam lithography was used to pattern all
levels, while other processing followed established
lines. Noteworthy results of the work included the
observation of a clear manifestation of velocity
overshoot, which contributed to achieving extrinsic
transconductances above 940$\mu$S/$\mu$m at 0.07-$\mu$m
gate length. The measured switching delay of ring
oscillators which contained 0.1-$\mu$m-gate-length
devices was as low as 13.1 ps, with simulations showing
potential for reduction to below 5 ps. Both the
transconductance and the switching times are the best
values observed for FETs to date-indicating continuing
value in the scaling of FETs to dimensions well beyond
those currently used.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560S (Other field effect devices); B2550
(Semiconductor device technology)",
classification = "B2550 (Semiconductor device technology); B2560S
(Other field effect devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.1 micron; 0.1 Micron; 77 K; direct-write
electron-beam lithography; Direct-write electron-beam
lithography; electron beam lithography; extrinsic
transconductances; Extrinsic transconductances; FET
technology; field effect transistors; gate length; Gate
length; overshoot; polysilicon-gated FETs;
Polysilicon-gated FETs; power-supply voltage;
Power-supply voltage; ring oscillators; Ring
oscillators; scaling; Scaling; semiconductor
technology; switching delay; Switching delay; velocity;
Velocity overshoot",
numericalindex = "Size 1.0E-07 m; Temperature 7.7E+01 K",
thesaurus = "Electron beam lithography; Field effect transistors;
Semiconductor technology",
treatment = "X Experimental",
}
@Article{Laux:1990:MCA,
author = "S. E. Laux and M. V. Fischetti and D. J. Frank",
title = "{Monte Carlo} analysis of semiconductor devices: The
{DAMOCLES} program",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "466--494",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The behavior of small semiconductor devices is
simulated using an advanced Monte Carlo carrier
transport model. The model improves upon the state of
the art by including the full band structure of the
semiconductor, by using scattering rates computed
consistently with the band structure, and by accounting
for both long-and short-range interactions between
carriers. It is sufficiently flexible to describe both
unipolar and bipolar device operation, for a variety of
semiconductor materials and device structures. Various
results obtained with the associated DAMOCLES program
for n- and p-channel Si MOSFETs, GaAs MESFETs, and Si
bipolar junction transistors are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el; GaAs/int As/int Ga/int GaAs/bin As/bin
Ga/bin",
classcodes = "B2560B (Modelling and equivalent circuits); B2560S
(Other field effect devices); B2560R (Insulated gate
field effect transistors); B2560J (Bipolar
transistors); C7410D (Electronic engineering)",
classification = "B2560B (Modelling and equivalent circuits); B2560J
(Bipolar transistors); B2560R (Insulated gate field
effect transistors); B2560S (Other field effect
devices); C7410D (Electronic engineering)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar device; Bipolar device operation; bipolar
junction transistors; Bipolar junction transistors;
bipolar transistors; carrier transport model; Carrier
transport model; DAMOCLES; DAMOCLES program; digital
simulation; field effect transistors; full band
structure; Full band structure; GaAs; insulated gate;
MESFETs; Monte Carlo analysis; Monte Carlo methods;
MOSFETs; operation; program; scattering rates;
Scattering rates; Schottky gate; semiconductor device
models; semiconductor devices; Semiconductor devices;
semiconductor materials; Semiconductor materials;
short-range interactions; Short-range interactions;
Si",
thesaurus = "Bipolar transistors; Digital simulation; Insulated
gate field effect transistors; Monte Carlo methods;
Schottky gate field effect transistors; Semiconductor
device models",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Jackson:1990:SGM,
author = "T. N. Jackson and B. J. {Van Zeghbroeck} and G. Pepper
and J. F. DeGelormo and T. Keuch and H. Meier and P.
Wolf",
title = "Submicron-gate-length {GaAs MESFETs}",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "495--505",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "It is well known that reducing gate length is a
powerful means of increasing the transconductance and
transit frequency of GaAs MESFET devices. However, by
reducing the gate length without scaling channel doping
and thickness, the performance obtained is limited by
short-channel effects and parasitics. This paper
presents an overview of work on two different MESFET
structures, illustrating how device performance can be
increased by decreasing the gate length, with the
result that appropriately scaled MESFETs compare
favorably with GaAs-AlGaAs heterojunction FETs. Recent
results on 0.15-$\mu$m-gate-length
implantation-self-aligned MESFETs suggest that it
should be possible to increase the speed of high-speed
GaAs MESFET (logic, analog, and microwave) circuits
through the use of devices having gate lengths less
than 0.5$\mu$m.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
classcodes = "B2560S (Other field effect devices)",
classification = "B2560S (Other field effect devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "channel doping; Channel doping; effect transistors;
effects; frequency; GaAs; gallium arsenide; gate
length; Gate length; III-V semiconductors;
implantation-self-aligned MESFETs;
Implantation-self-aligned MESFETs; MESFET devices;
parasitics; Parasitics; Schottky gate field;
semiconductor doping; short-channel; Short-channel
effects; transconductance; Transconductance; transit;
Transit frequency",
thesaurus = "Gallium arsenide; III-V semiconductors; Schottky gate
field effect transistors; Semiconductor doping",
treatment = "P Practical; X Experimental",
}
@Article{Keihl:1990:HFI,
author = "R. A. Keihl and P. M. Solomon and D. J. Frank",
title = "Heterojunction {FETs} in {III-V} compounds",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "506--529",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Reviews work on heterojunction FETs (HFETs) fabricated
from III-V compounds, with emphasis on the unique
properties of such devices and their applicability to
high-speed logic circuits. After discussing their
general properties, including their uniquely high
carrier mobility and fast switching speed, the authors
discuss HFETs investigated at the IBM Thomas J. Watson
Research Center, i.e., the
semiconductor-insulator-semiconductor FET (SISFET) and
quantum-well metal-insulator-semiconductor FET
(QW-MISFET)-and their possible circuit applications.
Finally, the opportunities for achieving a circuit
performance level beyond that offered by the
GaAs-(Al,Ga)As materials system are explored.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560R (Insulated gate field effect transistors);
B2520D (II- VI and III-V semiconductors)",
classification = "B2520D (II-VI and III-V semiconductors); B2560R
(Insulated gate field effect transistors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "carrier; carrier mobility; Carrier mobility; circuit;
Circuit performance level; effect transistors; FETs;
heterojunction; Heterojunction FETs; HFETs; high-speed
logic circuits; High-speed logic circuits; III-V
compounds; III-V semiconductors; insulated gate field;
logic devices; mobility; performance level;
quantum-well metal-insulator-semiconductor FET;
Quantum-well metal-insulator-semiconductor FET;
QW-MISFET; semiconductor-insulator-semiconductor FET;
Semiconductor-insulator-semiconductor FET; SISFET",
thesaurus = "Carrier mobility; III-V semiconductors; Insulated gate
field effect transistors; Logic devices",
treatment = "A Application; P Practical",
}
@Article{Heiblum:1990:BHT,
author = "M. Heiblum and M. V. Fischetti",
title = "Ballistic hot-electron transistors",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "530--549",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Presents an overview of work at the IBM Thomas J.
Watson Research Center on the tunneling hot-electron
transfer amplifier (THETA) device-including its use as
an amplifier and as a tool for investigating ballistic
hot-electron transport. In the initial, vertically
configured version of the device, a
quasi-monoenergetic, variable-energy, hot-electron beam
is generated (via tunneling) which traverses a thin
GaAs region and is then collected and energy-analyzed.
As the hot electrons traverse the device, they are used
to probe scattering events, band nonparabolicity,
size-quantization effects, and intervalley transfer. A
recent, lateral version of the device has been used to
demonstrate the existence of ballistic hot-electron
transport in the plane of a two-dimensional electron
gas, and the associated possibility of achieving high
gain.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
classcodes = "B2560J (Bipolar transistors)",
classification = "B2560J (Bipolar transistors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ballistic hot-; Ballistic hot-electron transport; Band
nonparabolicity; band nonparabolicity; bipolar
transistors; electron beam; electron gas; electron
transport; GaAs; gain; Gain; gallium arsenide; hot
electron; hot-; Hot-electron beam; III-V
semiconductors; intervalley transfer; Intervalley
transfer; quantization effects; Scattering events;
scattering events; size-; Size-quantization effects;
transistors; Tunneling hot-electron transfer amplifier;
tunneling hot-electron transfer amplifier;
two-dimensional; Two-dimensional electron gas;
vertically configured version; Vertically configured
version",
thesaurus = "Bipolar transistors; Gallium arsenide; Hot electron
transistors; III-V semiconductors",
treatment = "P Practical; X Experimental",
}
@Article{Tiwari:1990:CSH,
author = "S. Tiwari and S. L. Wright and D. J. Frank",
title = "Compound semiconductor heterostructure bipolar
transistors",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "550--567",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Presents an overview of our work on the technology,
material and electronic properties, and performance
limitations of compound semiconductor heterostructure
bipolar transistors. Graded-gap epitaxial n-type ohmic
contacts and p-type shallow diffusion ohmic contacts
are important in the fabrication of high-performance
(Al,Ga)As/GaAs devices. In the device structure
implemented, the presence of a wide-gap p-type
(Al,Ga)As extrinsic base region at the surface
suppresses surface recombination, thereby enhancing the
current gain at small device dimensions. The authors
discuss experimental and theoretical results concerning
the limiting physical effects due to heterostructure
design and intrinsic and extrinsic bulk phenomena of
compound semiconductors, emphasizing the understanding
developed and the discoveries made. As device speeds
have increased with coordinated scaling, dispersive
effects have become increasingly important. The authors
show how these may be included by modifying the
conventional quasi-static modeling of the bipolar
transistor, in order to obtain a realistic simulation
of fast switching transients. Finally, they discuss
scaling of heterostructure bipolar transistors, and
implications of the use of lower-bandgap materials and
operation at cryogenic temperatures.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "AlGaAs-GaAs/int AlGaAs/int GaAs/int Al/int As/int
Ga/int AlGaAs/ss Al/ss As/ss Ga/ss GaAs/bin As/bin
Ga/bin",
classcodes = "B2560J (Bipolar transistors); B2520D (II-VI and III-V
semiconductors); B2560B (Modelling and equivalent
circuits)",
classification = "B2520D (II-VI and III-V semiconductors); B2560B
(Modelling and equivalent circuits); B2560J (Bipolar
transistors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AlGaAs-GaAs devices; aluminium compounds; bipolar
transistors; bulk phenomena; Bulk phenomena; compound;
Compound semiconductor heterostructure bipolar
transistors; contacts; coordinated scaling; Coordinated
scaling; cryogenic; Cryogenic temperatures; current
gain; Current gain; design; device speeds; Device
speeds; dispersive effects; Dispersive effects;
electronic properties; Electronic properties;
epitaxial; Epitaxial n-type ohmic contacts; extrinsic
base region; Extrinsic base region; fast switching;
Fast switching transients; gallium arsenide;
heterojunction; heterostructure; Heterostructure
design; III-V semiconductors; limiting physical
effects; Limiting physical effects; lower-bandgap
materials; Lower-bandgap materials; n-type ohmic
contacts; ohmic contacts; p-type shallow diffusion
ohmic; P-type shallow diffusion ohmic contacts;
quasi-static modeling; Quasi-static modeling; scaling;
Scaling; semiconductor device models; semiconductor
heterostructure bipolar transistors; surface
recombination; Surface recombination; temperatures;
transients",
thesaurus = "Aluminium compounds; Gallium arsenide; Heterojunction
bipolar transistors; III-V semiconductors; Ohmic
contacts; Semiconductor device models",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Harder:1990:HGA,
author = "Ch. S. Harder and B. J. {Van Zeghbroeck} and M. P.
Kesler and H. P. Meier and P. Vettiger and D. J. Webb
and P. Wolf",
title = "High-speed {GaAs\slash AlGaAs} optoelectronic devices
for computer applications",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "568--584",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Presents an overview of low-threshold GaAs/AlGaAs
quantum-well laser diodes and GaAs
metal-semiconductor-metal photodetectors-two
optoelectronic devices which show good promise for use
in computer-related communication. Present-day
telecommunication device technology (based on InP
materials) is not well suited to the requirements of
optical data communication among and within computers
because the computer environment is much more
demanding. It imposes a higher ambient temperature on
the devices, and requires denser packaging and smaller
power dissipation per device, as well as a high degree
of parallelism. The GaAs/AlGaAs device technology is
ideally suited to this task because of the possibility
of integration of arrays of high-speed, low-threshold
laser diodes and high-speed photodetectors with
high-performance electronic circuits.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab., Switzerland",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "GaAs-AlGaAs/int AlGaAs/int GaAs/int Al/int As/int
Ga/int AlGaAs/ss Al/ss As/ss Ga/ss GaAs/bin As/bin
Ga/bin; GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
classcodes = "B4270 (Integrated optoelectronics); B6260 (Optical
links and equipment); B4320J (Semiconductor junction
lasers); C5690 (Other data communication equipment and
techniques); C5610S (System buses)",
classification = "B4270 (Integrated optoelectronics); B4320J
(Semiconductor junction lasers); B6260 (Optical links
and equipment); C5610S (System buses); C5690 (Other
data communication equipment and techniques)",
corpsource = "IBM Res. Div., Zurich Res. Lab., Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AlGaAs; aluminium compounds; ambient temperature;
Ambient temperature; computer interfaces;
Computer-related communication; computer-related
communication; data communication; denser packaging;
Denser packaging; equipment; GaAs; GaAs-; GaAs-AlGaAs;
gallium arsenide; high-performance electronic circuits;
High-performance electronic circuits; III-V
semiconductors; integrated optoelectronics; metal-;
Metal-semiconductor-metal photodetectors; optical
communication equipment; Optical data communication;
optical data communication; Optoelectronic devices;
optoelectronic devices; Parallelism; parallelism;
photodetectors; power dissipation; Power dissipation;
Quantum-well laser diodes; quantum-well laser diodes;
semiconductor junction lasers; semiconductor-metal
photodetectors",
thesaurus = "Aluminium compounds; Computer interfaces; Data
communication equipment; Gallium arsenide; III-V
semiconductors; Integrated optoelectronics; Optical
communication equipment; Photodetectors; Semiconductor
junction lasers",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Rubin:1990:EAM,
author = "B. J. Rubin",
title = "An electromagnetic approach for modeling
high-performance computer packages",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "585--600",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Described here is an electromagnetic approach for the
analysis of high-performance computer packages such as
the thermal conduction module (TCM) used in the IBM
3080 and 3090 processor units. Modeling of signal paths
and limitations of previous methods are discussed.
Numerical results are presented for propagation
characteristics associated with signal lines and vias,
and for coupled noise between signal lines. The results
are compared with those obtained by means of test
vehicles, scale models, and capacitance calculations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210 (Printed circuits);
C5420 (Mainframes and minicomputers); C5150 (Other
circuits for digital computers); C5490 (Other
aspects)",
classification = "B0170J (Product packaging); B2210 (Printed
circuits); C5150 (Other circuits for digital
computers); C5420 (Mainframes and minicomputers); C5490
(Other aspects)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "capacitance calculations; Capacitance calculations;
cooling; coupled; Coupled noise; digital computers; EM
analysis; high-performance computer packages;
High-performance computer packages; IBM 3080; IBM 3090;
IBM computers; mainframes; modules; noise; packaging;
propagation characteristics; Propagation
characteristics; scale models; Scale models; signal
lines; Signal lines; signal paths; Signal paths; test
vehicles; Test vehicles; thermal conduction module;
Thermal conduction module; vias; Vias",
thesaurus = "Cooling; Digital computers; IBM computers; Mainframes;
Modules; Packaging",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Deutsch:1990:HSP,
author = "A. Deutsch and G. V. Kopcsay and V. A. Ranieri and J.
K. Cataldo and E. A. Galligan and W. S. Graham and R.
P. McGuouey and S. L. Nunes and J. R. Paraszczak and J.
J. Ritsko and R. J. Serino and D. Y. Shih and J. S.
Wilczynski",
title = "High-speed signal propagation on lossy transmission
lines",
journal = j-IBM-JRD,
volume = "34",
number = "4",
pages = "601--615",
month = jul,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Addresses some of the problems encountered in
propagating high-speed signals on lossy transmission
lines encountered in high-performance computers. A
technique is described for including
frequency-dependent losses, such as skin effect and
dielectric dispersion, in transmission line analyses.
The disjoint group of available tools is brought
together, and their relevance to the propagation of
high-speed pulses in digital circuit applications is
explained. Guidelines are given for different
interconnection technologies to indicate where the
onset of severe dispersion takes place. Experimental
structures have been built and tested, and this paper
reports on their electrical performance and
demonstrates the agreement between measured data and
waveforms derived from analysis. The paper addresses
the problems found on lossy lines, such as reflections,
rise-time slowdown, increased delay, attenuation, and
crosstalk, and suggests methods for controlling these
effects in order to maintain distortion-free
propagation of high-speed signals.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B5240 (Transmission line
theory); B2160 (Wires and cables); C5150 (Other
circuits for digital computers); C5490 (Other
aspects)",
classification = "B0170J (Product packaging); B2160 (Wires and
cables); B5240 (Transmission line theory); C5150 (Other
circuits for digital computers); C5490 (Other
aspects)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; attenuation; Attenuation; crosstalk;
Crosstalk; delay; Delay; dielectric dispersion;
Dielectric dispersion; digital circuit; Digital circuit
applications; digital computers; digital signals;
dispersion; Dispersion; electrical performance;
Electrical performance; frequency-dependent;
Frequency-dependent losses; high-performance computers;
High-performance computers; high-speed; high-speed
pulses; High-speed pulses; High-speed signals;
interconnection technologies; Interconnection
technologies; line analyses; losses; lossy transmission
lines; Lossy transmission lines; packaging; rise-time
slowdown; Rise-time slowdown; signal propagation;
Signal propagation; signals; skin effect; Skin effect;
transmission; Transmission line analyses; transmission
lines; wiring",
thesaurus = "Crosstalk; Digital computers; Digital signals;
Packaging; Skin effect; Transmission lines; Wiring",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Wesley:1990:PCM,
author = "M. A. Wesley",
title = "Preface: Computer Modeling of Products and Processes",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "634--635",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Mantyla:1990:MST,
author = "M. Mantyla",
title = "A modeling system for top-down design of assembled
products",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "636--659",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The design of a mechanical product usually takes place
primarily in a top-down fashion, where the designer
first generates a rough, overall sketch of the product
and its main components. Later, the designer refines
the sketch to a detailed level while taking into
account the relevant requirements posed by strength,
cost, manufacturability, serviceability, and other
similar considerations. Current computer-aided design
(CAD) systems provide only limited support for this
kind of work. For instance, they cannot deal with
geometric or other information at varying levels of
detail, nor do they capture explicitly geometric
relationships among components intended to be joined
together in an assembly. This paper describes early
results of ongoing research on supporting top-down
design of mechanical products and discusses the major
requirements for CAD systems used for top-down design.
A prototype design system is described that provides
the following characteristics not usually found in
ordinary CAD systems: structuring of product
information in several layers, according to the stage
of the design process; representation of geometric
information about components at several levels of
detail; and representation and maintenance of geometric
relationships of components by means of a
constraint-satisfaction mechanism.",
acknowledgement = ack-nhfb,
affiliation = "Helsinki Univ. of Technol., Espoo, Finland",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering)",
classification = "C7440 (Civil and mechanical engineering)",
corpsource = "Helsinki Univ. of Technol., Espoo, Finland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "assembled products; Assembled products; CAD;
computer-aided design; Computer-aided design;
constraint-satisfaction mechanism;
Constraint-satisfaction mechanism; cost; Cost;
geometric; Geometric relationships; manufacturability;
Manufacturability; mechanical engineering computing;
mechanical product; Mechanical product; modeling
system; Modeling system; product information; Product
information; prototype design system; Prototype design
system; relationships; serviceability; Serviceability;
strength; Strength; top-down design; Top-down design",
thesaurus = "CAD; Mechanical engineering computing",
treatment = "P Practical",
}
@Article{Deckert:1990:CDS,
author = "K. L. Deckert",
title = "Computer-aided design of slider bearings in magnetic
disk files",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "660--667",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Reviews the application of lubrication theory to
slider bearings in magnetic disk files. For more than
thirty years, slider bearings have been used to
maintain close and precise spacings between recording
transducer and recording medium in disk files. Computer
modeling has been central to the design and performance
analysis of these systems. The topics covered are the
basic design, sensitivity and tolerance analysis,
dynamic characteristics, and response to disk
excitations from the disk. The main purpose of this
paper is to review the use of computer modeling in
design of slider bearings; however, the discussion of
slider modes in the slider dynamics section is new.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Products Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media); C7440 (Civil and mechanical
engineering)",
classification = "B3120B (Magnetic recording); C5320C (Storage on
moving magnetic media); C7440 (Civil and mechanical
engineering)",
corpsource = "IBM Gen. Products Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "CAD; disk; Disk excitations; dynamic characteristics;
Dynamic characteristics; excitations; lubrication
theory; Lubrication theory; magnetic disc storage;
magnetic disk files; Magnetic disk files; mechanical
engineering computing; recording medium; Recording
medium; recording transducer; Recording transducer;
sensitivity analysis; Sensitivity analysis; slider
bearings; Slider bearings; slider dynamics section;
Slider dynamics section; slider modes; Slider modes;
tolerance analysis; Tolerance analysis",
thesaurus = "CAD; Magnetic disc storage; Mechanical engineering
computing",
treatment = "P Practical",
}
@Article{Cooper:1990:DFA,
author = "E. S. Cooper",
title = "Disk file access-time constraints imposed by magnetic
air-bearing compliance",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "668--679",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Use is commonly made of coil voltages which produce
maximum acceleration and deceleration to wrest the
fastest access performance from the actuator of a disk
file. Alternatively, equivalent performance is easily
obtained with less control optimality by simply
increasing the coil voltage. A limit to greater coil
voltage, however, arises from the need to avoid harmful
effects when the servo loses control of the actuator,
the actuator slams into its crash stop, and the crash
force stresses the magnetic head air bearing. Magnetic
head air-bearing compliance, therefore, is one of three
fundamental constraints that limit the access-time
performance of an actuator. To obtain improved
access-time performance from a disk file, the following
should be optimized: the air-bearing slider, the
actuator crash stop, and the actuator mechanical time
constant. This paper presents relevant design
considerations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Products Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media)",
classification = "C5320C (Storage on moving magnetic media)",
corpsource = "IBM Gen. Products Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acceleration; Acceleration; access performance; Access
performance; actuator; Actuator; actuator crash stop;
Actuator crash stop; actuator mechanical; Actuator
mechanical time constant; coil voltages; Coil voltages;
deceleration; Deceleration; disk file; Disk file;
electric actuators; magnetic air-bearing compliance;
Magnetic air-bearing compliance; magnetic disc storage;
servo; Servo; servomechanisms; time constant",
thesaurus = "Electric actuators; Magnetic disc storage;
Servomechanisms",
treatment = "P Practical",
}
@Article{Jones:1990:SFE,
author = "F. Jones and J. S. Logan",
title = "A simple finite element model for reactive
sputter-deposition systems",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "680--692",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The method of finite element analysis is used to
calculate oxygen-concentration profiles and
oxygen-absorption rates at the substrate and along the
shields in a RF magnetron reactive sputtering system
having a 12-inch-diameter magnetron. Results for
several shield arrangements are calculated as a
function of oxygen flow rate. The approach used assumes
the following: (i) the target is being sputtered in the
metallic state; (ii) the oxygen-concentration profile
in the system can be calculated from the diffusion
equation; (iii) the maximum amount of oxygen that can
be absorbed at any point in the system is proportional
to the metal deposition rate at that point; (iv) the
target absorbs no oxygen as long as it is in the
metallic state. The relative metal deposition rate
along the substrate and shields is calculated,
normalized to the measured deposition rate at the
substrate, and used as a boundary condition for the
diffusion equation. The calculated oxygen flow rate for
the formation of stoichiometric substrate films agrees
with experimental results to within 15\%. The critical
flow rate at which the target oxidizes, Q$_c$, is
measured experimentally and when used in the model
gives an oxygen partial pressure of about 0.31.10/sup
-6/ torr at the sputtering track.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8115C (Deposition by sputtering); B0520F (Vapour
deposition)",
classification = "A8115C (Deposition by sputtering); B0520F (Vapour
deposition)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.31E-6; 0.31E-6 torr; boundary; Boundary condition;
condition; critical flow rate; Critical flow rate;
diffusion equation; Diffusion equation; films; finite
element analysis; finite element model; Finite element
model; magnetron; magnetrons; metal deposition rate;
Metal deposition rate; metallic; Metallic state; oxygen
flow rate; Oxygen flow rate; oxygen partial pressure;
Oxygen partial pressure; oxygen-absorption rates;
Oxygen-absorption rates; oxygen-concentration profiles;
Oxygen-concentration profiles; reactive
sputter-deposition systems; Reactive sputter-deposition
systems; RF; RF magnetron; shield arrangements; Shield
arrangements; sputter deposition; state; stoichiometric
substrate; Stoichiometric substrate films; torr",
numericalindex = "Pressure 4.1E-05 Pa",
thesaurus = "Finite element analysis; Magnetrons; Sputter
deposition",
treatment = "T Theoretical or Mathematical",
}
@Article{Dukovic:1990:CCD,
author = "J. O. Dukovic",
title = "Computation of current distribution in
electrodeposition, a review",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "693--705",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Reviews the research literature that has appeared
since 1980 on computer calculations of current
distribution in the field of electrodeposition. Key
contributions and general trends are identified, with
particular emphasis given to applications in the
electronics industry. The survey reveals how numerical
models have provided the technology of
electrodeposition with general understanding,
predictive power, and the capability of optimizing
deposit uniformity. Anticipated developments for the
nineties are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520 (Thin film growth)",
classification = "B0520 (Thin film growth)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer calculations; Computer calculations; current
distribution; Current distribution; deposit uniformity;
Deposit uniformity; electrodeposition;
Electrodeposition; electronics industry; Electronics
industry; numerical models; Numerical models; reviews",
thesaurus = "Current distribution; Electrodeposition; Reviews",
treatment = "G General Review; P Practical",
}
@Article{Young:1990:FEA,
author = "K. F. Young",
title = "Finite element analysis of planar stress anisotropy
and thermal behavior in thin films",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "706--717",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "To show the capability and diversity of finite element
analysis, the authors calculate three-dimensional
planar anisotropic stress distributions for various
thin-film geometries and materials in response to
thermal and electrical stimuli, for specific boundary
conditions. The simulated residual film stresses are
verified with acoustic microscopy measurements,
substrate flexure measurements, and the use of thermal
environment techniques. Simple shapes are analyzed as
building blocks for more complex structures. Effects of
nonlinear electrical resistance are also analyzed.",
acknowledgement = ack-nhfb,
affiliation = "Storage Syst. Products Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6860 (Physical properties of thin films,
nonelectronic); A0260 (Numerical approximation and
analysis)",
classification = "A0260 (Numerical approximation and analysis); A6860
(Physical properties of thin films, nonelectronic)",
corpsource = "Storage Syst. Products Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acoustic microscopy; Acoustic microscopy measurements;
anisotropic stress distributions; Anisotropic stress
distributions; conditions; electrical stimuli;
Electrical stimuli; environment techniques; finite
element analysis; Finite element analysis; internal;
measurements; nonlinear electrical resistance;
Nonlinear electrical resistance; planar stress
anisotropy; Planar stress anisotropy; residual film
stresses; Residual film stresses; specific boundary;
Specific boundary conditions; stresses; substrate
flexure measurements; Substrate flexure measurements;
thermal; thermal behavior; Thermal behavior; Thermal
environment techniques; thermal stimuli; Thermal
stimuli; thermal stresses; thin-film geometries;
Thin-film geometries",
thesaurus = "Acoustic microscopy; Finite element analysis; Internal
stresses; Thermal stresses",
treatment = "T Theoretical or Mathematical",
}
@Article{Shareef:1990:TBX,
author = "I. A. Shareef and J. R. Maldonado and Y. Vladimirsky
and D. L. Katcoff",
title = "Thermoelastic behavior of {X-ray} lithography masks
during irradiation",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "718--735",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Presents computer calculations of thermoelastic
effects in X-ray lithography masks caused by the
absorption of X-rays during exposure. Several mask
structures are considered, with different substrate and
absorber materials, using finite element analysis. Part
I of the paper deals with short-pulse X-ray irradiation
(e.g. from gas plasma, laser-heated plasma, or
exploding wire sources), and Part II describes
irradiation during exposure with a
synchrotron-storage-ring X-ray source. For the
short-pulse irradiation, results indicate a maximum
rise in temperature on the mask of about 30 degrees C
for a 2-ns exposure with a 10-mJ/cm/sup 2/ X-ray pulse.
Mechanical static analysis shows that the maximum
stress in the absorber films, which is due to maximum
temperature differences in the mask layers, occurs at
the end of the pulse. The magnitude of the induced
thermoelastic stress is found comparable to the
intrinsic stress level of the mask materials (typically
2-5*10/sup 8/ dyn/cm/sup 2/). The analysis indicates
that when pulse amplitudes reach 10 mJ/cm/sup 2/, there
will be a need for experimental study of X-ray mask
distortion during exposure to short X-ray pulses. A
one-dimensional model is developed for the case of
storage-ring irradiation. The model predicts
distortions of the printed image due to a thermal wave
developed on the mask by scanning of the X-ray beam.
Experimental results are presented showing that the
effect is negligible under normal operating conditions
but may become noticeable for operation in vacuum or
without proper heat sinks.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); C7410D (Electronic
engineering)",
classification = "B2550G (Lithography); C7410D (Electronic
engineering)",
corpsource = "IBM Res. Div., Thomas J Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "distortion; electronic engineering computing;
exploding wire; Exploding wire sources; finite element
analysis; Finite element analysis; gas plasma; Gas
plasma; induced thermoelastic; Induced thermoelastic
stress; intrinsic stress level; Intrinsic stress level;
irradiation; laser-heated plasma; Laser-heated plasma;
mask; Mask distortion; Mask structures; masks; Masks;
maximum; Maximum stress; one-dimensional model;
One-dimensional model; operating conditions; Operating
conditions; pulse amplitudes; Pulse amplitudes;
scanning; Scanning; short-pulse X-ray; Short-pulse
X-ray irradiation; sources; stress; structures;
synchrotron radiation; synchrotron-storage-ring X-ray
source; Synchrotron-storage-ring X-ray source;
temperature differences; Temperature differences;
thermal stresses; thermal wave; Thermal wave;
thermoelastic effects; Thermoelastic effects;
thermoelasticity; X-ray lithography",
thesaurus = "Electronic engineering computing; Finite element
analysis; Masks; Synchrotron radiation; Thermal
stresses; Thermoelasticity; X-ray lithography",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Farouki:1990:PH,
author = "R. T. Farouki and T. Sakkalis",
title = "{Pythagorean} hodographs",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "736--752",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "65D17 (53A04)",
MRnumber = "92a:65063",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The hodograph of a plane parametric curve r(t)=(x(t),
y(t)) is the locus described by the first parametric
derivative r'(t)=(x'(t), y'(t)) of that curve. A
polynomial parametric curve is said to have a
Pythagorean hodograph if there exists a polynomial
sigma (t) such that x'/sup 2/(t)+y'/sup 2/(t) identical
to sigma /sup 2/(t), i.e. (x'(t), y'(t), sigma (t))
form a `Pythagorean triple'. Although
Pythagorean-hodograph curves have fewer degrees of
freedom than general polynomial curves of the same
degree, they exhibit remarkably attractive properties
for practical use. For example, their arc length is
expressible as a polynomial function of the parameter,
and their offsets are rational curves. The authors
present a sufficient-and-necessary algebraic
characterization of the Pythagorean-hodograph property,
analyze its geometric implications in terms of
Bernstein-Bezier forms, and survey the useful
attributes it entails in various applications.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290F (Interpolation and function approximation);
C4130 (Interpolation and function approximation)",
classification = "B0290F (Interpolation and function approximation);
C4130 (Interpolation and function approximation)",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Arc length; arc length; Bernstein-Bezier forms; curve
fitting; hodograph property; parametric curve;
Parametric derivative; parametric derivative; plane
parametric curve; Plane parametric curve; polynomial;
Polynomial parametric curve; polynomials; Pythagorean-;
Pythagorean-hodograph property; rational curves;
Rational curves",
thesaurus = "Curve fitting; Polynomials",
treatment = "T Theoretical or Mathematical",
}
@Article{Milenkovic:1990:FCC,
author = "V. J. Milenkovic and L. R. Nackman",
title = "Finding compact coordinate representations for
polygons and polyhedra",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "753--769",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Practical solid modeling systems are plagued by
numerical problems that arise from using floating-point
arithmetic. For example, polyhedral solids are often
represented by a combination of geometric and
combinatorial information. The geometric information
may consist of explicit plane equations, with
floating-point coefficients; the combinatorial
information may consist of face, edge, and vertex
adjacencies and orientations, with edges defined by
face-face adjacencies and vertices by edge-edge
adjacencies. Problems arise when numerical roundoff
error in geometric operations causes the geometric
information to become inconsistent with the
combinatorial information. These problems can be
avoided by using exact arithmetic instead of
floating-point arithmetic. However, some operations,
such as rotation, increase the number of bits required
to represent the plane equation coefficients. Since the
execution time of exact arithmetic operators increases
with the number of bits in the operands, the increased
number of bits in the plane equation coefficients can
cause performance problems. One proposed solution to
this performance problem is to round the plane equation
coefficients without altering the combinatorial
information. We show that such rounding is
NP-complete.",
acknowledgement = ack-nhfb,
affiliation = "Harvard Univ., Cambridge, MA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques)",
classification = "C6130B (Graphics techniques)",
corpsource = "Harvard Univ., Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adjacencies; Adjacencies; combinatorial information;
Combinatorial information; compact coordinate
representations; Compact coordinate representations;
exact arithmetic; Exact arithmetic; execution time;
Execution time; explicit; Explicit plane equations;
floating-point arithmetic; Floating-point arithmetic;
geometric information; Geometric information;
NP-complete; numerical; Numerical roundoff error;
operands; Operands; orientations; Orientations; plane
equations; polygons; Polygons; polyhedra; Polyhedra;
roundoff error; roundoff errors; solid modeling
systems; Solid modeling systems; solid modelling",
thesaurus = "Roundoff errors; Solid modelling",
treatment = "P Practical",
}
@Article{Neff:1990:FDB,
author = "C. A. Neff",
title = "Finding the distance between two circles in
three-dimensional space",
journal = j-IBM-JRD,
volume = "34",
number = "5",
pages = "770--775",
month = sep,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "51M25 (65D17 65Y25)",
MRnumber = "91i:51030",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper investigates, from an algebraic point of
view, the problem of finding the distance between two
circles located in R/sup 3/. It is shown, by combining
a theorem about solvable permutation groups and some
explicit calculations with a computer algebra system,
that, in general, the distance between two circles is
an algebraic function of the parameters defining them,
but that this function is not solvable in terms of
radicals. Although this result implies that one cannot
find a `closed-form' solution for the distance between
an arbitrary pair of circles in R/sup 3/, the author
discusses how such an algebraic quantity can still be
manipulated symbolically by combining standard
polynomial operations with an algorithm for isolating
the real roots of a polynomial in a convenient data
structure for real algebraic numbers. This data
structure and its operations have been implemented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C6120 (File
organisation)",
classification = "C6120 (File organisation); C6130B (Graphics
techniques)",
corpsource = "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebraic; algebraic function; Algebraic function;
Algebraic quantity; arbitrary pair; Arbitrary pair;
CAD; circles; Circles; data structure; Data structure;
data structures; groups; polynomials; quantity; solid
modelling; solvable permutation; Solvable permutation
groups; standard polynomial operations; Standard
polynomial operations; three-dimensional space;
Three-dimensional space",
thesaurus = "CAD; Data structures; Polynomials; Solid modelling",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Kuech:1990:PTL,
author = "T. F. Kuech",
title = "Preface: Thin-Layer Formation",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "794--794",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:49 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Beach:1990:DLT,
author = "D. B. Beach",
title = "Design of low-temperature thermal chemical vapor
deposition processes",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "795--805",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The importance of an integrated approach involving
synthetic chemistry, physical chemistry, and chemical
engineering to the development of new thermal chemical
vapor deposition (CVD) processes for the production of
thin-film electronic materials is discussed. Particular
emphasis is placed on choosing precursor molecules with
facile thermal decomposition pathways that lead to pure
films at low temperatures. Two examples from the
author's laboratories, the deposition of copper from
trialkylphosphine cyclopentadienyl copper complexes and
the deposition of gallium nitride from diethylgallium
azide, are used to illustrate the principles of
precursor selection, the design factors for the
construction of thermal CVD reactors, and the selection
of processing conditions that optimize production of
the desired material. In addition, new work on the
thermal CVD of copper using an advanced reactor and
examples of selective copper deposition and conformal
copper deposition using the reactor are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/el; GaN/bin Ga/bin N/bin",
classcodes = "B2550 (Semiconductor device technology); B0520F
(Vapour deposition)",
classification = "B0520F (Vapour deposition); B2550 (Semiconductor
device technology)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chemical vapour deposition; conformal deposition;
Conformal deposition; copper; Cu deposition;
decomposition pathways; deposition; design factors;
Design factors; diethylgallium azide; Diethylgallium
azide; electronic materials; gallium compounds; GaN
deposition; III-V; low temperature thermal CVD; Low
temperature thermal CVD; metallisation; precursor
molecules; Precursor molecules; process design; Process
design; processing conditions; Processing conditions;
production of thin-film; Production of thin-film
electronic materials; selective; Selective deposition;
semiconductor technology; semiconductor thin films;
semiconductors; thermal; thermal CVD; Thermal CVD;
Thermal decomposition pathways; trialkylphosphine
cyclopentadienyl; Trialkylphosphine cyclopentadienyl
copper",
thesaurus = "Chemical vapour deposition; Copper; Gallium compounds;
III-V semiconductors; Metallisation; Semiconductor
technology; Semiconductor thin films",
treatment = "N New Development; P Practical; X Experimental",
}
@Article{Meyerson:1990:LSS,
author = "B. S. Meyerson",
title = "Low-temperature {Si} and {Si:Ge} epitaxy by
ultrahigh-vacuum\slash chemical vapor deposition:
Process fundamentals",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "806--815",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Overview of work on the chemical and physical
considerations underlying the development of a
low-temperature chemical vapor deposition process,
designated ultrahigh-vacuum/chemical vapor deposition
(UHV/CVD). The origins of the rigorous vacuum and
chemical purity requirements of the process are
discussed. Operating in the range of 500 degrees C, the
process has made it possible to explore the use, in
silicon-based devices and atomic-length-scale
structures, of a number of metastable materials in the
Si:Ge:B system. Also discussed is associated
experimental work on the fabrication of high-speed
heterojunction bipolar transistors and high-mobility
two-dimensional hole-gas structures.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si:B/int Si/int B/int Si:B/bin Si/bin B/bin Si/el
B/el B/dop; Si:Ge/int Ge/int Si/int Si:Ge/bin Ge/bin
Si/bin Ge/el Si/el Ge/dop; Si/int Si/el",
classcodes = "B0510D (Epitaxial growth); B2550 (Semiconductor device
technology)",
classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
device technology)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "atomic-length-scale structures; Atomic-length-scale
structures; chemical; Chemical purity requirements;
chemical vapor deposition; Chemical vapor deposition;
CVD; elemental semiconductors; germanium;
heterojunction bipolar transistors; Heterojunction
bipolar transistors; high-mobility two-dimensional
hole-gas structures; High-mobility two-dimensional
hole-gas structures; low temperature CVD; Low
temperature CVD; metastable materials; Metastable
materials; process fundamentals; Process fundamentals;
purity requirements; semiconductor doping;
semiconductor growth; Si; Si:B; Si:Ge; silicon; UHV;
vacuum requirements; Vacuum requirements; vapour phase
epitaxial growth; VPE",
thesaurus = "Elemental semiconductors; Germanium; Semiconductor
doping; Semiconductor growth; Silicon; Vapour phase
epitaxial growth",
treatment = "X Experimental",
}
@Article{Ginsberg:1990:SEG,
author = "B. J. Ginsberg and J. Burghartz and G. B. Bronner and
S. R. Mader",
title = "Selective epitaxial growth of silicon and some
potential applications",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "816--827",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In the selective epitaxial growth (SEG) of silicon,
growth occurs only on exposed silicon areas of a
silicon substrate. Substrate regions on which silicon
growth is not desired are masked by a dielectric film,
typically silicon dioxide or silicon nitride. Use of
the process permits the fabrication of novel silicon
devices and integrated-circuit structures. In this
paper, an overview is presented of the authors' studies
on the SEG process at the IBM Thomas J. Watson Research
Center. Aspects covered are the kinetics of the process
using a SiCl$_4$ and H$_2$ gaseous mixture, the
associated suppression of deposition on silicon dioxide
and silicon nitride, and some potential applications of
the process to the fabrication of bipolar devices and
dynamic random access memory (DRAM) cells.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "SiCl4H2/ss Cl4/ss Cl/ss H2/ss Si/ss H/ss; SiO2/bin
O2/bin Si/bin O/bin; Si3N4/bin Si3/bin N4/bin Si/bin
N/bin; Si/int Si/el",
classcodes = "B2550 (Semiconductor device technology); B0510D
(Epitaxial growth)",
classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
device technology)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "IBM; mask; process; process kinetics; Process
kinetics; SEG; SEG process; selective epitaxial growth;
Selective epitaxial growth; semiconductor epitaxial
layers; semiconductor growth; Si growth; Si$_3$N$_4$
mask; Si/sub 3/N/sub 4/ mask; SiCl$_4$-H$_2$ gas
mixture; SiCl/sub 4/-H$_2$ gas mixture; silicon;
SiO$_2$; SiO$_2$ mask; vapour phase epitaxial growth",
thesaurus = "Semiconductor epitaxial layers; Semiconductor growth;
Silicon; Vapour phase epitaxial growth",
treatment = "A Application; P Practical; X Experimental",
}
@Article{Tischler:1990:AMV,
author = "M. A. Tischler",
title = "Advances in metalorganic vapor-phase epitaxy",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "828--848",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Metalorganic vapor-phase epitaxy (MOVPE) has become a
well-established technique for the epitaxial growth of
layers of III-V compound semiconductors since its
introduction in 1968. Use has been made of the
technique to produce such layers and associated devices
to very demanding specifications. This paper describes
MOVPE, followed by an overview of work at the IBM
Thomas J. Watson Research Center on the technique, with
emphasis on doping and selective epitaxy. Device
applications are included to highlight the need to take
into account the influence of materials and growth
phenomena in order to produce optimum devices.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0510D (Epitaxial growth); B2550 (Semiconductor device
technology)",
classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
device technology)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "III-V compound semiconductors; III-V semiconductors;
layers; metalorganic vapor-phase epitaxy; Metalorganic
vapor-phase epitaxy; MOVPE; reviews; Selective epitaxy;
selective epitaxy; semiconductor epitaxial;
Semiconductor epitaxy; semiconductor epitaxy;
semiconductor growth; vapour phase epitaxial growth",
thesaurus = "III-V semiconductors; Reviews; Semiconductor epitaxial
layers; Semiconductor growth; Vapour phase epitaxial
growth",
treatment = "B Bibliography; G General Review; X Experimental",
}
@Article{Grill:1990:DCF,
author = "A. Grill and B. S. Meyerson and V. V. Patel",
title = "Diamondlike carbon films by {RF} plasma-assisted
chemical vapor deposition from acetylene",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "849--857",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper is an overview of studies performed at the
IBM Thomas J. Watson Research Center on diamondlike
carbon (hydrogenated amorphous carbon) films, including
some recent results on their tribological properties.
The films were prepared by RF plasma-assisted chemical
vapor deposition (PACVD) from acetylene. Their
structure and composition were characterized by a
variety of methods such as X-ray and TEM
diffractometry, XPS, high-resolution /sup 13/C NMR
spectroscopy, and H(/sup 15/N alpha, gamma)C
nuclear-reaction profiling. Their adhesion to various
substrates, coefficients of static and dynamic
friction, and wear resistance were also characterized.
It was found that the films were essentially amorphous,
reaching their bulk composition after 40 nm of growth
above the initial growth interface. Their bulk
composition included about 40\% hydrogen. More
diamondlike carbon bonding was obtained at the initial
growth interface than in the bulk range. The ratio of
sp/sup 2/ to sp/sup 3/ carbon atoms was found to be
1.6, with virtually all sp/sup 3/ carbon atoms bound to
one or more hydrogen atoms. The diamondlike carbon
films (DLC) displayed excellent adhesion to the surface
of Si.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "C:H/bin C/bin H/bin C/el H/el H/dop; C:H/int Si/int
C/int H/int C:H/bin C/bin H/bin Si/el C/el H/el H/dop",
classcodes = "A8115H (Chemical vapour deposition); A8280P (Electron
spectroscopy for chemical analysis (photoelectron,
Auger spectroscopy, etc.)); A7960E (Semiconductors and
insulators); A6855 (Thin film growth, structure, and
epitaxy)A7660 (Nuclear magnetic resonance and
relaxation); A8140P (Friction, lubrication, and wear);
A6220P (Tribology); A8160 (Corrosion, oxidation,
etching, and other surface treatments); B0520F (Vapour
deposition)",
classification = "A6220P (Tribology); A6855 (Thin film growth,
structure, and epitaxy); A7660 (Nuclear magnetic
resonance and relaxation); A7960E (Semiconductors and
insulators); A8115H (Chemical vapour deposition);
A8140P (Friction, lubrication, and wear); A8160
(Corrosion, oxidation, etching, and other surface
treatments); A8280P (Electron spectroscopy for chemical
analysis (photoelectron, Auger spectroscopy, etc.));
B0520F (Vapour deposition)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acetylene; Acetylene; adhesion; Adhesion; amorphous
C:H films; Amorphous C:H films; amorphous state; bulk
composition; Bulk composition; carbon; coefficient of
friction; Coefficient of friction; composition;
Composition; deposition; diamondlike carbon films;
Diamondlike carbon films; DLC; electron microscope
examination of materials; hydrogen; IBM; materials;
NMR; NMR spectroscopy; nuclear magnetic;
nuclear-reaction profiling; Nuclear-reaction profiling;
overview; Overview; PACVD; plasma CVD; plasma-assisted
chemical vapor; Plasma-assisted chemical vapor
deposition; protective coatings; resistance; resonance;
spectroscopy; TEM diffractometry; transmission;
tribological properties; Tribological properties;
tribology; wear; Wear resistance; wear resistant
coatings; X-ray diffraction examination of; X-ray
photoelectron spectra; XPS",
thesaurus = "Amorphous state; Carbon; Hydrogen; Nuclear magnetic
resonance; Plasma CVD; Protective coatings;
Transmission electron microscope examination of
materials; Tribology; Wear resistant coatings; X-ray
diffraction examination of materials; X-ray
photoelectron spectra",
treatment = "G General Review; X Experimental",
}
@Article{Small:1990:OWV,
author = "M. B. Small and D. J. Pearson",
title = "On-chip wiring for {VLSI}: Status and directions",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "858--867",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A consequence of scaling to submicron dimensions is
that the major component of propagation delay will
transfer from the devices to the interconnecting
`wires'. Additionally, increased integration, together
with scaling, leads to a need for more numerous
interconnections on a chip and higher current
densities. Accommodation to these changes will
necessitate the use of new materials arranged in
three-dimensional wiring structures which have the
ability to make the most effective use of the area of
the chip. Generic processing routes to achieve the
desired structures are reviewed and examples are
presented of two experimental structures with layers of
planar wiring and vertical vias between planes. One of
these integrates aluminum-alloy wiring with tungsten
vias in a silicon dioxide dielectric; the other
integrates copper wiring and vias in polyimide
dielectric with the goal of minimizing delay due to
on-chip wiring.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al/bin Al/el; W/el; SiO2/int O2/int Si/int O/int
SiO2/bin O2/bin Si/bin O/bin; Cu/el; Cu/el",
classcodes = "B2570F (Other MOS integrated circuits); B2550F
(Metallisation)",
classification = "B2550F (Metallisation); B2570F (Other MOS integrated
circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Al alloy vias; circuits; Cu vias; Cu wiring;
dimensions; experimental; Experimental structures;
integrated circuit technology; interconnections;
Interconnections; Layers of planar wiring; layers of
planar wiring; metallisation; Minimizing delay;
minimizing delay; MOS integrated; Multilevel
metallisation; multilevel metallisation; On-chip
wiring; on-chip wiring; Polyimide dielectric; polyimide
dielectric; Propagation delay; propagation delay;
Scaling; scaling; SiO$_2$ dielectric; structures;
submicron; Submicron dimensions; three-dimensional
wiring structures; Three-dimensional wiring structures;
Vertical vias; vertical vias; vias; VLSI; W; W vias",
thesaurus = "Integrated circuit technology; Metallisation; MOS
integrated circuits; VLSI",
treatment = "G General Review; X Experimental",
}
@Article{Tu:1990:SIE,
author = "K. N. Tu",
title = "Surface and interfacial energies of {CoSi$_2$} and
{Si} films: Implications regarding formation of
three-dimensional silicon-silicide structures",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "868--874",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Formation of three-dimensional, multilevel structures
consisting of epitaxial silicon and silicide films is
currently of interest in the microelectronics
technology. However, such structures have been
difficult to produce because of surface wetting
differences. To obtain associated surface energy
information, an analysis was carried out of published
data on the kinetics of crystallization of amorphous
CoSi$_2$ and Si films. The analysis indicated that the
amorphous-to-crystalline interfacial energy of
amorphous CoSi$_2$ films is about one-fourth that of
amorphous Si films, from which it was inferred that the
surface energy of epitaxial CoSi$_2$ films is less than
that of epitaxial Si films. The approach used in the
analysis is general and should be extendable to other
systems.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si-CoSi2/int CoSi2/int Si2/int Co/int Si/int
CoSi2/bin Si2/bin Co/bin Si/bin Si/el; Si/el; CoSi2/bin
Si2/bin Co/bin Si/bin",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A6810C (Surface energy (surface tension, interface
tension, angle of contact, etc.)); A6840 (Surface
energy of solids; thermodynamic properties); B0510D
(Epitaxial growth); B2550 (Semiconductor device
technology)",
classification = "A6810C (Surface energy (surface tension, interface
tension, angle of contact, etc.)); A6840 (Surface
energy of solids; A6855 (Thin film growth, structure,
and epitaxy); B0510D (Epitaxial growth); B2550
(Semiconductor device technology); thermodynamic
properties)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D Si-CoSi$_2$ structures; Amorphous CoSi$_2$ films;
amorphous CoSi$_2$ films; amorphous-to-;
Amorphous-to-crystalline interfacial energy; cobalt
compounds; crystalline interfacial energy; elemental
semiconductors; energy; epitaxial; epitaxial CoSi$_2$
films; Epitaxial CoSi/sub 2/ films; epitaxial Si;
Epitaxial Si films; films; Kinetics of crystallization;
kinetics of crystallization; layers; Multilevel
structures; multilevel structures; semiconductor;
semiconductor epitaxial layers; semiconductors;
Semiconductors; Si-CoSi$_2$; silicides; Silicides;
silicon; surface; Surface energy; surface energy;
Surface wetting differences; surface wetting
differences; technology",
thesaurus = "Cobalt compounds; Elemental semiconductors; Epitaxial
layers; Semiconductor epitaxial layers; Semiconductor
technology; Silicon; Surface energy",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Yu:1990:SCW,
author = "M. L. Yu and K. Y. Ahn and R. V. Joshi",
title = "Surface chemistry of the {WF}$_6$-based chemical vapor
deposition of tungsten",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "875--883",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Discusses two deposition processes. In the first
process, tungsten deposition occurs through the
chemical reduction of WF$_6$ by a silicon substrate.
The thickness of the tungsten film thus grown is
limited by the transport of silicon through the
deposited film. In the second process, deposition
occurs in a WF$_6$-silane mixture by the following
reactions: reduction of adsorbed WF$_6$ by a surface
layer of silicon to form tungsten, and the concurrent
dehydrogenation of the adsorbed silane to replenish the
silicon. This process permits the deposition of
tungsten on any substrate, provided the initial
reaction of the substrate with the WF$_6$-silane
mixture can provide a tungsten or silicon `seed' layer
to initiate the reaction cycle. Furthermore, the
process is not limited by tungsten film thickness and
hence permits the deposition of relatively thick films.
Although surface selectivity is possible with regard to
materials such as high-quality SiO$_2$, on which such a
seed layer cannot be formed, the selectivity is
adversely affected by the presence of particulates.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "WF6/bin F6/bin F/bin W/bin; Si/sur Si/el; WF6SiH4/ss
F6/ss H4/ss Si/ss F/ss H/ss W/ss",
classcodes = "B2550F (Metallisation); B2570 (Semiconductor
integrated circuits); B0520F (Vapour deposition)",
classification = "B0520F (Vapour deposition); B2550F (Metallisation);
B2570 (Semiconductor integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "6/-SiH/sub 4/ gas mixture; chemical vapour deposition;
deposition processes; Deposition processes; integrated
circuit technology; metallisation; reaction cycle;
Reaction cycle; Si substrate; Surface chemistry;
surface chemistry; Surface selectivity; surface
selectivity; tungsten; tungsten compounds; VLSI; WF$_6$
vapour; WF$_6$-SiH$_4$ gas mixture; WF/sub; WF/sub 6/
vapour",
thesaurus = "Chemical vapour deposition; Integrated circuit
technology; Metallisation; Tungsten; Tungsten
compounds; VLSI",
treatment = "X Experimental",
}
@Article{Speriosu:1990:MTF,
author = "V. S. Speriosu and D. A. {Herman, Jr.} and I. L.
Sanders and T. Yogi",
title = "Magnetic thin films in recording technology",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "884--902",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Reviews recent progress in magnetic thin films for use
in recording media and heads. Emphasis is on work that
has been carried out at IBM. Topics covered include
thin-film media for high-density recording, laminated
soft-magnetic films for controlling domains and
extending the frequency range of inductive heads,
exchange-biasing of magnetoresistive sensors, and
magnetic multilayer structures.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3110C (Ferromagnetic
materials)",
classification = "B3110C (Ferromagnetic materials); B3120B (Magnetic
recording)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "biasing of magnetoresistive sensors; controlling
domains; Controlling domains; exchange-;
Exchange-biasing of magnetoresistive sensors; film
media; film recording heads; films; frequency range
extension; Frequency range extension; hard discs;
high-density recording; High-density recording; IBM;
inductive heads; Inductive heads; laminated
soft-magnetic; Laminated soft-magnetic films; magnetic;
Magnetic; magnetic heads; Magnetic heads; magnetic
multilayer; Magnetic multilayer structures; magnetic
thin films; Magnetic thin films; recording; recording
media; Recording media; Recording technology; reviews;
structures; technology; thin; Thin film recording
heads; thin film recording media; Thin film recording
media; thin-; Thin-film media",
thesaurus = "Hard discs; Magnetic heads; Magnetic thin films;
Reviews",
treatment = "B Bibliography; G General Review; X Experimental",
}
@Article{Farrow:1990:MMS,
author = "R. F. C. Farrow and C. H. Lee and S. S. P. Parkin",
title = "Magnetic multilayer structures",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "903--915",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This is an overview of work at the IBM Almaden
Research Center on magnetic multilayer structures
comprising one, several, or many magnetic films
sandwiched between nonmagnetic films. In recent years
there has been increasing interest in such structures
because of their novel and potentially useful
properties. Recent examples of magnetic multilayer
structures grown by molecular beam epitaxy (MBE) and
sputtering are described. It is seen that MBE and
sputtering are complementary techniques for the
preparation of such structures, and that the ability to
modify their magnetic properties by suitably designing
their architecture is a key to their further
development.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7570F (Magnetic ordering in multilayers); A8115C
(Deposition by sputtering); A6855 (Thin film growth,
structure, and epitaxy); A8115G (Vacuum deposition);
B3110C (Ferromagnetic materials); B0510D (Epitaxial
growth)",
classification = "A6855 (Thin film growth, structure, and epitaxy);
A7570F (Magnetic ordering in multilayers); A8115C
(Deposition by sputtering); A8115G (Vacuum deposition);
B0510D (Epitaxial growth); B3110C (Ferromagnetic
materials)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Almaden Research Center; films; IBM; magnetic;
magnetic films sandwiched between nonmagnetic; Magnetic
films sandwiched between nonmagnetic films; magnetic
multilayer; Magnetic multilayer structures; Magnetic
properties; magnetic thin films; MBE; molecular beam
epitaxial growth; Molecular beam epitaxy; molecular
beam epitaxy; properties; reviews; sputtered coatings;
Sputtering; sputtering; structures",
thesaurus = "Magnetic thin films; Molecular beam epitaxial growth;
Reviews; Sputtered coatings",
treatment = "G General Review; X Experimental",
}
@Article{Giess:1990:LGP,
author = "E. A. Giess and R. L. Sandstrom and W. J. Gallagher
and A. Gupta and S. L. Shinde and R. F. Cook and E. I.
Cooper and E. J. M. O'Sullivan and J. M. Roldan and A.
P. Segmuller and J. Angilello",
title = "Lanthanide gallate perovskite-type substrates for
epitaxial, high-${T}_c$ superconducting
{Ba}$_2${YCu}$_3${O}$_{7-\delta}$ films",
journal = j-IBM-JRD,
volume = "34",
number = "6",
pages = "916--926",
month = nov,
year = "1990",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Previous studies had indicated promising use of
lanthanide gallate perovskite-type substrates for the
deposition of epitaxial, high-T$_c$ superconducting
Ba$_2$YCu$_3$O$_{7-\delta}$ (BYCO) films. They were
also found to have moderate dielectric constants (
approximately 25 compared to approximately 277 for
SrTiO$_3$). This study was undertaken to further
explore the use of LaGaO$_3$, NdGaO$_3$, SrTiO$_3$,
MgO, and Y-stabilized ZrO$_2$ substrates, prepared from
single-crystal boules grown by several suppliers using
the Czochralski method. Films were prepared by
cylindrical magnetron sputtering and laser ablation.
Substrate evaluations included measurement of
dielectric constant and loss, thermal expansion, and
mechanical hardness and toughness. In addition to their
moderate dielectric constants, they were found to have
satisfactory mechanical properties, except for the
twinning tendency of LaGaO$_3$. Lattice mismatch
strains were calculated for orthorhombic BYCO films on
a number of substrates. NdGaO$_3$ was found to have the
best lattice match with BYCO, and is now available
twin-free.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Ba2YCu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss;
LaGaO3/sur Ga/sur La/sur O3/sur O/sur LaGaO3/ss Ga/ss
La/ss O3/ss O/ss; NdGaO3/sur Ga/sur Nd/sur O3/sur O/sur
NdGaO3/ss Ga/ss Nd/ss O3/ss O/ss; SrTiO3/sur TiO3/sur
O3/sur Sr/sur Ti/sur O/sur SrTiO3/ss TiO3/ss O3/ss
Sr/ss Ti/ss O/ss; MgO/sur Mg/sur O/sur MgO/bin Mg/bin
O/bin",
classcodes = "A7475 (Superconducting films); A7430 (General
properties); A7470V (Perovskite phase superconductors);
A6855 (Thin film growth, structure, and epitaxy); A6570
(Thermal expansion and thermomechanical effects); A7740
(Dielectric loss and relaxation); A7720 (Permittivity);
B3220 (Superconducting materials)",
classification = "A6570 (Thermal expansion and thermomechanical
effects); A6855 (Thin film growth, structure, and
epitaxy); A7430 (General properties); A7470V
(Perovskite phase superconductors); A7475
(Superconducting films); A7720 (Permittivity); A7740
(Dielectric loss and relaxation); B3220
(Superconducting materials)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Ba$_2$YCu$_3$O$_{7-\delta}$; Ba$_2$YCu/sub 3/O/sub 7-
delta /; barium compounds; cylindrical magnetron;
Cylindrical magnetron sputtering; dielectric constants;
Dielectric constants; dielectric losses; Dielectric
losses; epitaxial films; Epitaxial films; expansion;
hardness; high temperature superconductors; High
temperature superconductors; high-temperature;
LaGaO$_3$; LaGaO/sub 3/; lanthanum compounds; laser
ablation; Laser ablation; lattice mismatch strains;
Lattice mismatch strains; magnesium compounds;
mechanical; Mechanical hardness; mechanical properties;
Mechanical properties; MgO; NdGaO/sub 3/; neodymium
compounds; permittivity; perovskite-type;
Perovskite-type substrates; sputtering; SrTiO$_3$;
SrTiO/sub 3/; strontium compounds; substrates;
superconducting epitaxial layers; superconductors;
tendency; thermal; thermal expansion; Thermal
expansion; toughness; Toughness; twinning; Twinning
tendency; yttrium compounds; zirconium compounds",
thesaurus = "Barium compounds; Dielectric losses; High-temperature
superconductors; Lanthanum compounds; Magnesium
compounds; Neodymium compounds; Permittivity; Strontium
compounds; Substrates; Superconducting epitaxial
layers; Thermal expansion; Yttrium compounds; Zirconium
compounds",
treatment = "X Experimental",
}
@Article{Farrell:1991:PVI,
author = "E. J. Farrell",
title = "Preface: Visual Interpretation of Complex Data",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "3--3",
month = jan,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Bala:1991:FIV,
author = "G. P. Bala",
title = "{FEMvis}: an interactive visualization tool for
mechanical analysis",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "4--11",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "FEMvis is a tool that provides capabilities for
interactive visualization of mechanical engineering
analysis, including rotation, translation, and
magnification of images; views of shape deformations,
their time-evolution, and their superposition;
visualizations of scalar fields in two or three
dimensions using colored isolevels, blending of shape
deformation images and isolevel images; visualizations
of three-dimensional phenomena by moving a slicing
plane through the image, showing cross-sectional
deformations and isolevels; and visualizations of
multiple shape deformations and multiple scalar fields
during a single usage sessions. FEMvis has been
implemented in a portable language and a portable
graphics package, and can run on a spectrum of hardware
platforms from workstations to mainframes. It has been
applied to the mechanical analysis of direct-access
storage devices (DASD), including stress, strain,
modal, and deformation analyses. The interactive nature
of FEMvis facilitates iterative design refinement and
rapid prototyping.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering); C6130B
(Graphics techniques); C6180 (User interfaces)",
classification = "C6130B (Graphics techniques); C6180 (User
interfaces); C7440 (Civil and mechanical engineering)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D phenomena; cross-; Cross-sectional deformations;
deformation images; direct-access; Direct-access
storage devices; engineering analysis; engineering
computing; engineering graphics; graphical user
interfaces; Interactive visualization; interactive
visualization; Isolevel images; isolevel images;
Iterative design refinement; iterative design
refinement; Magnification; magnification; mechanical;
Mechanical analysis; mechanical analysis; Mechanical
engineering analysis; Multiple scalar fields; multiple
scalar fields; Multiple shape deformations; multiple
shape deformations; package; portable graphics;
Portable graphics package; Portable language; portable
language; prototyping; rapid; Rapid prototyping;
Rotation; rotation; sectional deformations; shape;
Shape deformation images; Shape deformations; shape
deformations; Slicing plane; slicing plane; software
packages; storage devices; Superposition;
superposition; Time-evolution; time-evolution;
Translation; translation; Workstations; workstations",
thesaurus = "Engineering graphics; Graphical user interfaces;
Mechanical engineering computing; Software packages",
treatment = "P Practical; R Product Review",
}
@Article{Koyamada:1991:VVF,
author = "K. Koyamada and T. Nishio",
title = "Volume visualization of {3D} finite element method
results",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "12--25",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes a method for visualizing the
output data set of a 3D finite element method result. A
linear tetrahedral element is used as a primitive for
the visualization processing, and a 3D finite element
model is subdivided into a set of these primitives,
which are generated at every solid element. With these
primitives, isosurfaces are visualized
semitransparently from scalar data at each node point.
Two methods are developed for the visualization of
isosurfaces with and without intermediate geometries.
The methods are applied to output data sets from some
simulation results of a semiconductor chip. These are
visualized, and the effectiveness of the method is
discussed.",
acknowledgement = ack-nhfb,
affiliation = "Tokyo Res. Center, IBM Japan Ltd., Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7400 (Engineering);
C4170 (Differential equations); C4180 (Integral
equations)",
classification = "C4170 (Differential equations); C4180 (Integral
equations); C6130B (Graphics techniques); C7400
(Engineering)",
corpsource = "Tokyo Res. Center, IBM Japan Ltd., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D finite element method; analysis; engineering
computing; engineering graphics; finite element;
Isosurfaces; isosurfaces; linear; Linear tetrahedral
element; Output data set; output data set;
Semiconductor chip; semiconductor chip; solid
modelling; tetrahedral element",
thesaurus = "Engineering computing; Engineering graphics; Finite
element analysis; Solid modelling",
treatment = "P Practical",
}
@Article{Farrell:1991:VIM,
author = "E. J. Farrell and P. A. Appino and D. P. Foty and T.
D. {Linton, Jr.}",
title = "Visual interpretation of multidimensional computations
and transistor design",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "26--44",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "As digital simulations and computations become more
complex, larger volumes of output are generated; the
engineer must select a concise method of displaying the
output and extracting relevant information. The authors
describe an experimental system called the Visual
Interpretation System (VIS), which provides a wide
range of tools for managing the visualization of
simulation data. The effectiveness of VIS results from
an interactive interface which controls a database
manager and a visualization manager. The database
consists of entities called data sets that carry a
complete description of the geometry and time-dependent
behavior of various properties of a simulated physical
object. Visualization management involves both 2D and
3D imaging in multiple display windows and animation.
Three-dimensional data imaging is based on optical
modeling with back-to-front perspective projection. The
optical model assigns color and attenuation to each
point on the basis of its data value. With the
appropriate choice of attenuation and color, the user
can display multiple 3D regions, either as solids or
transparently. This approach is not based on surface,
nor does it require the data to have spatial
continuity. The usefulness of VIS is demonstrated with
data from a large-scale simulation of a transistor.
They demonstrate how 3D visualization techniques
provide insight into the physics of
isolation-trench-bounded devices at both room and low
temperatures, which facilitates the development of
improved designs.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560R (Insulated gate field effect transistors);
C7410D (Electronic engineering); C6130B (Graphics
techniques)",
classification = "B2560R (Insulated gate field effect transistors);
C6130B (Graphics techniques); C7410D (Electronic
engineering)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D visualization; 3D visualization techniques;
Animation; animation; Back-to-front perspective
projection; back-to-front perspective projection;
circuit analysis computing; Database manager; database
manager; dependent behavior; digital; digital
simulation; Digital simulations; engineering; graphics;
insulated gate field effect transistors; interactive;
Interactive interface; interface;
Isolation-trench-bounded devices;
isolation-trench-bounded devices; Large-scale
simulation; large-scale simulation; Multidimensional
computations; multidimensional computations; Multiple
display windows; multiple display windows; Optical
modeling; optical modeling; semiconductor device
models; simulations; solid modelling; techniques;
time-; Time-dependent behavior; Transistor; transistor;
Transistor design; transistor design; transistors;
Visual Interpretation System; Visualization manager;
visualization manager",
thesaurus = "Circuit analysis computing; Digital simulation;
Engineering graphics; Insulated gate field effect
transistors; Semiconductor device models; Solid
modelling; Transistors",
treatment = "B Bibliography; P Practical",
}
@Article{Doi:1991:DVU,
author = "A. Doi and M. Aono and N. Urano and K. Sugimoto",
title = "Data visualization using a general-purpose renderer",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "45--58",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes a general approach to data
visualization, based on the Rendering Subroutine
Package (RSP). RSP is a general-purpose polygon-based
renderer, and is IBM's first rendering application
programming interface (API) for users who wish to
develop their own applications. The authors present an
overview of the system, details of the image synthesis
tools, and several examples of the application of RSP
to architectural CAD, molecular graphics, and computer
tomography.",
acknowledgement = ack-nhfb,
affiliation = "IBM Yamato Lab., IBM Japan Ltd., Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7400 (Engineering)",
classification = "C6130B (Graphics techniques); C7400 (Engineering)",
corpsource = "IBM Yamato Lab., IBM Japan Ltd., Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application programming interface; Architectural CAD;
architectural CAD; Computer tomography; computer
tomography; Data visualization; data visualization;
engineering computing; engineering graphics;
General-purpose renderer; general-purpose renderer;
Image synthesis; image synthesis; Molecular graphics;
molecular graphics; Polygon-based renderer;
polygon-based renderer; rendering; Rendering; Rendering
application programming interface; Rendering Subroutine
Package; RSP; solid modelling; Subroutine Package",
thesaurus = "Engineering computing; Engineering graphics; Solid
modelling",
treatment = "P Practical",
}
@Article{Dickinson:1991:IAT,
author = "R. R. Dickinson",
title = "Interactive analysis of the topology of {4D} vector
fields",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "59--66",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Interactive visualization methods are now evolving in
response to a need to provide more immediate access to
particular features of interest to analysts at
particular points in the space and time of their data.
The paper focuses on feature extraction methods
relevant to the analysis of vector fields. In vector
fields, `critical points' are those points at which the
vector magnitude passes through zero. The word
`topology' is used to describe the interconnection
patterns between critical points.Topology is central to
the understanding of vector fields. It provides very
succinct and precise summary information, and can be
used to subdivide large fields into well-defined
subregions. Methods for interactively creating maps of
vector-field topology are described. The advantages
offered by interactive methods in comparison with
automatic methods are also discussed.",
acknowledgement = ack-nhfb,
affiliation = "Pacific Visualization Syst., Senneville, Que.,
Canada",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7310 (Mathematics)",
classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
corpsource = "Pacific Visualization Syst., Senneville, Que.,
Canada",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "4D vector fields; computer aided analysis; computer
graphics; computing; Critical points; critical points;
Feature extraction methods; feature extraction methods;
Interconnection patterns; interconnection patterns;
mathematics; Topology; topology; Vector magnitude;
vector magnitude; vectors",
thesaurus = "Computer aided analysis; Computer graphics;
Mathematics computing; Vectors",
treatment = "P Practical",
}
@Article{Stoll:1991:PPT,
author = "E. P. Stoll",
title = "Picture processing and three-dimensional visualization
of data from scanning tunneling and atomic force
microscopy",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "67--77",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The author presents an overview of the current status
of picture processing and three-dimensional
visualization of data from scanning tunneling
microscopy and related techniques. The topics covered
include the physical basis of the resolution limit and
noise sources in scanning microscopes, the design of
restoration filters, and methods of visualizing surface
contours and other surface properties by use of
shadowing, contour lines, and superimposed colors.
Postprocessed images of gold, graphite, biological
molecules, the active zone of a laser diode, and
silicon illustrate the outstanding quality of these
methods.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Zurich Res. Lab., Ruschlikon,
Switzerland",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Au/el; Si/el",
classcodes = "A0650D (Data gathering, processing, and recording,
data displays including digital techniques); A6116D
(Electron microscopy determinations); A0780 (Electron
and ion microscopes and techniques); C5260B (Computer
vision and picture processing); C6130B (Graphics
techniques); C7320 (Physics and Chemistry)",
classification = "A0650D (Data gathering, processing, and recording,
data displays including digital techniques); A0780
(Electron and ion microscopes and techniques); A6116D
(Electron microscopy determinations); C5260B (Computer
vision and picture processing); C6130B (Graphics
techniques); C7320 (Physics and Chemistry)",
corpsource = "IBM Res. Div., Zurich Res. Lab., Ruschlikon,
Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D data visualization; Active zone; active zone;
atomic; Atomic force microscopy; atomic force
microscopy; Au; Biological molecules; biological
molecules; colors; computer graphics; computerised;
Contour lines; contour lines; force microscopy; Gold;
gold; Graphite; graphite; Laser diode; laser diode;
Noise sources; noise sources; Picture processing;
picture processing; Resolution limit; resolution limit;
Restoration filters; restoration filters; Scanning
tunneling microscopy; scanning tunneling microscopy;
scanning tunnelling microscopy; Shadowing; shadowing;
Si; Silicon; silicon; superimposed; Superimposed
colors; Surface contours; surface contours; Surface
properties; surface properties",
thesaurus = "Atomic force microscopy; Computer graphics;
Computerised picture processing; Scanning tunnelling
microscopy",
treatment = "G General Review",
}
@Article{Barberi:1991:DML,
author = "F. Barberi and R. Bernstein and M. T. Pareschi and R.
Santacroce",
title = "Displaying morphological and lithological maps: a
numerically intensive computing and visualization
application",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "78--87",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Algorithms for evaluating digital terrain models
(DEMs) and elevation moments such as slope, aspect,
relief, and curvature are discussed. Significant new
applications based on the elaboration and display of
such data are presented. The results show that the
processed data can be used for environmental protection
and to identify topography-dependent natural-disaster
hazards.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Earth Sci., Pisa Univ., Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7890 (Other special
applications); C5260B (Computer vision and picture
processing)",
classification = "C5260B (Computer vision and picture processing);
C6130B (Graphics techniques); C7890 (Other special
applications)",
corpsource = "Dept. of Earth Sci., Pisa Univ., Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Aspect; aspect; cartography; computer graphics;
computerised picture; Curvature; curvature; Digital
terrain models; digital terrain models; Elevation
moments; elevation moments; Environmental protection;
environmental protection; Lithological maps;
lithological maps; Natural-disaster hazards;
natural-disaster hazards; Numerically intensive
computing; numerically intensive computing; Processed
data; processed data; processing; Relief; relief;
Slope; slope; Visualization; visualization",
thesaurus = "Cartography; Computer graphics; Computerised picture
processing",
treatment = "P Practical",
}
@Article{Turtur:1991:IID,
author = "A. Turtur and F. Prampolini and M. Fantini and R.
Guarda and M. A. Imperato",
title = "{IDB}: an image database system",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "88--96",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Specialized software and hardware tools are needed to
work on digital color images: the usability of an image
system implies the availability of such resources
inside a coherent environment and a friendly user
interface. Furthermore, a large volume of data must be
efficiently stored and retrieved. To cope with these
problems, the prototype of an image database system,
named IDB, has been developed to manage image data in
an integrated way. The important features of the system
are distributed functions, a multi-user environment,
interactivity, and modularity.",
acknowledgement = ack-nhfb,
affiliation = "IBM Rome Sci. Center., Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6160Z (Other DBMS)",
classification = "C6160Z (Other DBMS)",
corpsource = "IBM Rome Sci. Center., Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "database management systems; Digital color images;
digital color images; Distributed functions;
distributed functions; environment; Hardware tools;
hardware tools; Image database system; image database
system; Interactivity; interactivity; Modularity;
modularity; multi-user; Multi-user environment; User
interface; user interface",
thesaurus = "Database management systems",
treatment = "P Practical",
}
@Article{Young:1991:VSH,
author = "F. W. Young and P. Rheingans",
title = "Visualizing structure in high-dimensional multivariate
data",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "97--107",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors present and discuss several dynamic
statistical graphics tools designed to help the data
analyst visually discover and formulate hypotheses
about the structure of multivariate data. All tools are
based on the notion of the `data space,' a
representation of multivariate data as a
high-dimensional (hD) space which has a dimension for
each variable (column of the data) and a point for each
case (row of the data). The data space is projected
orthogonally onto the `visual space,' a
three-dimensional space which is seen and manipulated
by the data analyst. The visual space has a point-like
object for each case and can have a vector-like object
for each variable. The three dimensions of the visual
space are orthogonal linear combinations of the
variables. They discuss the notion of a `guided tour'
of multivariate data space, and present guided-tour
tools, including: (1) 6D-rotation, a tool for
dynamically rotating, in six-dimensional (6D) space,
from one 3D portion of the data space to another while
displaying the dynamically changing projection in the
visual space; (2) hD-residualization, a tool that
determines, at the user's request, the largest
invisible 3D space; (3) projection-cueing, a group of
three tools that use change in object brightness as a
cue to show change in aspects of the projection of
objects from the data space to the visual space during
hD-rotation. In addition to these tools for touring
high-dimensional multivariate space, they discuss tools
for manipulating the 3D visual space, and a tool for
examining the relationship between two data spaces.
Finally they present a guided-tour implementation in
which the user manipulates joysticks and sliders to
dynamically and smoothly control the graphics tools in
real time.",
acknowledgement = ack-nhfb,
affiliation = "North Carolina Univ., Chapel Hill, NC, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7310 (Mathematics)",
classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
corpsource = "North Carolina Univ., Chapel Hill, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "6D-rotation; computer graphics; data analysis; Data
analyst; data analyst; Data space; data space; Graphics
tools; graphics tools; Guided-tour tools; guided-tour
tools; hD-; HD-residualization; Multivariate data;
multivariate data; Object brightness; object
brightness; Projection-cueing; projection-cueing;
residualization; statistical; statistical analysis;
Statistical graphics; statistical graphics; Statistical
graphics tools; Structure visualization; structure
visualization; Visual space; visual space",
thesaurus = "Computer graphics; Data analysis; Statistical
analysis",
treatment = "P Practical",
}
@Article{Williams:1991:VMD,
author = "G. N. Williams and E. L. Nelson and D. M. Barnett and
K. Parmley",
title = "Visualization of molecular dynamics via ray-tracing
and animation in a vectorized environment",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "108--118",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Scientific visualization methodologies are being
utilized increasingly in attempts to understand
physical phenomena via mathematical and simulation
model results. The authors present the results of a
visualization project which produced a vectorized,
high-resolution, ray-traced animation of the dynamics
of a protein molecule. The resulting animation was
recorded on 35-mm film, with a resolution of 1024*1024
pixels with 24 color bits. Run-time statistics were
also collected which relate image generation parameter
ranges and interdependencies.",
acknowledgement = ack-nhfb,
affiliation = "Texas A and M Univ., College Station, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8715H (Molecular dynamics, molecular probes,
molecular pattern recognition); C7320 (Physics and
Chemistry); C6130B (Graphics techniques)",
classification = "A8715H (Molecular dynamics, molecular probes,
molecular pattern recognition); C6130B (Graphics
techniques); C7320 (Physics and Chemistry)",
corpsource = "Texas A and M Univ., College Station, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1024; 1024 Pixels; 1048576 Pixels; 1048576 pixels;
Animation; animation; computer animation; computer
graphics; environment; geometrical optics; molecular
biophysics; Molecular dynamics; molecular dynamics;
physics computing; pixels; Protein molecule; protein
molecule; proteins; Ray-tracing; ray-tracing;
vectorized; Vectorized environment; Visualization
project; visualization project",
numericalindex = "Picture size 1.024E+03 pixel; Picture size
1.048576E+06 pixel",
thesaurus = "Computer animation; Computer graphics; Geometrical
optics; Molecular biophysics; Physics computing;
Proteins",
treatment = "P Practical",
}
@Article{Briscolini:1991:ACS,
author = "M. Briscolini and P. Santangelo",
title = "Animation of computer simulations of two-dimensional
turbulence and three-dimensional flows",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "119--139",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "One of the most challenging problems in fluid dynamics
is understanding the properties of turbulent flows. The
advent of large supercomputers permits the
investigation of turbulence with great accuracy in two
dimensions, but full three-dimensional problems are
physically more complex and their study is currently
limited to the case of simple flows. It is shown that
the availability of a continuous time-dependent
representation of the dynamics of fluid flows can
quickly lead to more complete understanding of the many
concurrent physical mechanisms ruling turbulence. Some
significant examples show how an analog videotape,
obtained from direct computer simulations of fluid
flows, suggests physical results that can later be
obtained through a mathematical analysis of the
numerical simulations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "A4725 (Turbulent flows, convection, and heat
transfer); A4780 (Instrumentation for fluid dynamics);
C7320 (Physics and Chemistry); C6130B (Graphics
techniques)",
classification = "A4725 (Turbulent flows, convection, and heat
transfer); A4780 (Instrumentation for fluid dynamics);
C6130B (Graphics techniques); C7320 (Physics and
Chemistry)",
corpsource = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2D turbulence; 3D flows; computer animation; Computer
simulations; computer simulations; continuous
time-dependent; Continuous time-dependent
representation; digital simulation; dynamics; flow
visualisation; fluid; Fluid dynamics; Fluid flows;
fluid flows; physics computing; representation;
Supercomputers; supercomputers; turbulence",
thesaurus = "Computer animation; Digital simulation; Flow
visualisation; Physics computing; Turbulence",
treatment = "P Practical",
}
@Article{Arnold:1991:NIC,
author = "R. F. Arnold and P. Halpern and G. R. Hogsett and B.
T. Straka and C. Arasmith and J. McElroy",
title = "A numerically intensive computing environment: {IBM}
3090 and the {PS/2 Model 80}",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "140--155",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Recent advances in personal computer workstations,
such as the IBM Personal System/2 Model 80 with its
increased memory and CPU speed, loosely coupled with a
host IBM 3090 Processor, can provide considerable
computing advantages for executing and visualizing
numerically intensive computing (NIC) applications. The
authors have developed a prototype visualization
environment which demonstrates effective use of this
hardware. The user interface for the NIC application is
written using Microsoft Windows on the PS/2 Model 80
running DOS 3.3. The PS/2 Model 80 is connected to a
host 3090 via a PC network. The user enters requests
which are application parameters and selects graphic
views for displaying the output results file. The
entries are made through user dialog screens on the
workstations. The user view of the system is such that
it appears that it is running on the workstation. To
achieve this transparency, file caches are used on both
the workstation and the host. The cache on the host is
in the form of graphic metafiles and numeric data. The
cache on the workstation contains metafiles. Requests
are monitored on the workstation to determine whether
the results are in the local cache. When they are not,
a request file is transferred to the host and checked
against the host cache. The NIC application is run only
when the requested result is not in either cache. In
order to reduce the file size, the results file is
converted to a metafile before being transferred to the
workstation.",
acknowledgement = ack-nhfb,
affiliation = "IBM Palo Alto Sci. Center, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5540 (Terminals and graphic displays)",
classification = "C5540 (Terminals and graphic displays)",
corpsource = "IBM Palo Alto Sci. Center, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "80; caches; computer graphic equipment; DOS 3.3; file;
File caches; Graphic metafiles; graphic metafiles; IBM
3090 Processor; IBM computers; IBM Personal System/2
Model; IBM Personal System/2 Model 80; interface;
Microsoft Windows; Numeric data; numeric data; Personal
computer workstations; personal computer workstations;
Transparency; transparency; user; User interface;
Visualization environment; visualization environment;
workstations",
thesaurus = "Computer graphic equipment; IBM computers;
Workstations",
treatment = "P Practical",
}
@Article{Moini:1991:AVT,
author = "S. Moini",
title = "Application of visualization tools in solid
mechanics",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "156--166",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "With increasingly complex digital simulations and
computations, large volumes of numerical output are
generated, and users must select more effective
techniques for handling and displaying such output in
order to extract relevant information. In this study,
visualization techniques such as animation, tracking,
and 2D/3D color displays are imbedded in implicit and
explicit finite element codes for solving complex
solid-mechanics problems. With these techniques, the
investigator can more fully utilize computer time and
better understand the results of long and costly
computations. This investigation demonstrates the
effectiveness of different visualization techniques and
distributed computing on an IBM platform.",
acknowledgement = ack-nhfb,
affiliation = "IBM Sci. Center, Palo Alto, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7440 (Civil and mechanical engineering); C6130B
(Graphics techniques)",
classification = "C6130B (Graphics techniques); C7440 (Civil and
mechanical engineering)",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2D/3D color displays; analysis; Animation; animation;
codes; Digital simulation; digital simulation;
engineering graphics; finite element; Finite element
codes; IBM platform; Solid mechanics; solid mechanics;
Solid-mechanics problems; solid-mechanics problems;
structural engineering computing; Tracking; tracking;
Visualization tools; visualization tools",
thesaurus = "Digital simulation; Engineering graphics; Finite
element analysis; Structural engineering computing",
treatment = "P Practical",
}
@Article{Piccolo:1991:GWS,
author = "F. Piccolo and V. Zecca and A. Grimaudo and C.
Loiodice",
title = "Graphic workstations and supercomputers: an integrated
environment for simulation of fluid dynamics problems",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "167--183",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An integrated environment for simulation and
visualization of physics and engineering problems of
industrial interest has been set up at the IBM European
Center for Scientific and Engineering Computing
(ECSEC). Te paper describes the environment, its
components, and some experiments carried on at ECSEC to
represent 3D objects displayed with the shading
technique and the solution of fluid dynamics problems,
all treated with the finite element method. Moreover,
the paper describes the animation experiments developed
to represent dynamics phenomena (fluid flows) and
presents a videotape showing the time evolution of
three fluid dynamics study cases.",
acknowledgement = ack-nhfb,
affiliation = "IBM Italy Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "A4780 (Instrumentation for fluid dynamics); C5540
(Terminals and graphic displays); C7320 (Physics and
Chemistry); C6130B (Graphics techniques)",
classification = "A4780 (Instrumentation for fluid dynamics); C5540
(Terminals and graphic displays); C6130B (Graphics
techniques); C7320 (Physics and Chemistry)",
corpsource = "IBM Italy Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D objects; Animation experiments; animation
experiments; computer graphic equipment; computer
graphics; Dynamics phenomena; dynamics phenomena;
ECSEC; element analysis; environment; finite; Finite
element method; finite element method; flow
visualisation; Fluid dynamics; fluid dynamics; Graphics
workstations; graphics workstations; integrated;
Integrated environment; physics computing; shading;
Shading technique; Supercomputers; supercomputers;
technique",
thesaurus = "Computer graphic equipment; Computer graphics; Finite
element analysis; Flow visualisation; Physics
computing",
treatment = "P Practical",
}
@Article{Treinish:1991:CVT,
author = "L. A. Treinish and C. Goettsche",
title = "Correlative visualization techniques for
multidimensional data",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "184--204",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Critical to the understanding of data is the ability
to provide pictorial or visual representations of those
data, particularly in support of correlative data
analysis. Despite the many advances in visualization
techniques for scientific data over the last several
years, there are still significant problems in bringing
today's hardware and software technology into the hands
of the typical scientist. A generalized approach to
data visualization is critical for the correlative
analysis of distinct, complex, multidimensional data
sets in the space and earth sciences. Different classes
of data representation techniques must be used within
such a framework, which can range from simple, static
two- and three-dimensional line plots to animation,
surface rendering, and volumetric imaging. Static
examples of actual data analyses illustrate the
importance of an effective pipeline in a data
visualization system.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7310 (Mathematics)",
classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; Animation; animation; computer animation;
computer graphics; data; Data analysis; data analysis;
Multidimensional data; multidimensional data;
rendering; Representation techniques; representation
techniques; surface; Surface rendering; Visual
representations; visual representations; Volumetric
imaging; volumetric imaging",
thesaurus = "Computer animation; Computer graphics; Data analysis",
treatment = "P Practical",
}
@Article{Peskin:1991:IQV,
author = "R. L. Peskin and S. S. Walther and A. M. Froncioni and
T. I. Boubez",
title = "Interactive quantitative visualization",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "205--226",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Interactive quantitative visualization, a methodology
to enhance scientific and engineering computational
simulation prototyping, is defined. Appropriate
strategies for implementing IQV in a workstation-based
distributed computing environment are discussed.
Object-oriented graphical tools and a new data
management technique to support IQV and computational
steering are described. Two examples of IQV and
computational steering are presented: (1) a system to
allow interactive solution and visualization of
nonlinear boundary-value problems; and (2) a modeling
exercise illustrating how IQV and computational
steering are used together to prototype simulation of a
complex physical system, namely a flag flapping in the
wind.",
acknowledgement = ack-nhfb,
affiliation = "Rutgers Univ., Puscataway, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7320 (Physics and
Chemistry)",
classification = "C6130B (Graphics techniques); C7320 (Physics and
Chemistry)",
corpsource = "Rutgers Univ., Puscataway, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "boundary-value problems; Complex physical system;
complex physical system; Computational steering;
computational steering; computer graphics; computing
environment; data management; Data management
technique; distributed; Distributed computing
environment; Flag flapping; flag flapping; Graphical
tools; graphical tools; interactive quantitative;
Interactive quantitative visualization; IQV; nonlinear
boundary-value; Nonlinear boundary-value problems;
object-oriented; Object-oriented tools; object-oriented
tools; physics computing; problems; programming;
Simulation prototyping; simulation prototyping;
technique; visualization",
thesaurus = "Boundary-value problems; Computer graphics;
Object-oriented programming; Physics computing",
treatment = "P Practical",
}
@Article{Pickover:1991:PRG,
author = "C. A. Pickover",
title = "Picturing randomness on a graphics supercomputer",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "227--230",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper provides a light introduction to a simple
graphics technique which can be used to represent
random data on a graphics supercomputer. The
representation, called a noise-sphere, can be used to
detect `bad' random-number generators with little
training on the part of the observer. The system uses
lighting and shading facilities of 3D extensions to the
X-Windows or the PHIGS+ standard. Computational recipes
and suggestions for future experiments are included.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C7310 (Mathematics)",
classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer graphics; Graphics supercomputer; graphics
supercomputer; Graphics technique; graphics technique;
Lighting; lighting; mathematics computing;
Noise-sphere; noise-sphere; PHIGS+ standard; Random
data; random data; random processes; Random-number
generators; random-number generators; Randomness;
randomness; Shading; shading; X-Windows",
thesaurus = "Computer graphics; Mathematics computing; Random
processes",
treatment = "P Practical",
}
@Article{Paolini:1991:IGT,
author = "G. V. Paolini and P. Santangelo",
title = "An interactive graphic tool to plot the structure of
large sparse matrices",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "231--237",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Many engineering and scientific problems involve the
solution of large sparse linear systems. To determine
an optimal solving strategy for such systems, it is
essential to understand the large- and small-scale
properties of the associated sparse matrices. The
authors presents a graphic tool to analyze the sparsity
pattern and the numeric structure of these matrices.
Through examples, drawn from our practical experience,
they demonstrate the effectiveness and the interactive
features of the tool. These features include zooming,
scrolling in different directions, sorting of rows
and/or columns, and selective plotting, according to
the values of the matrix coefficients.",
acknowledgement = ack-nhfb,
affiliation = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques); C4140 (Linear algebra);
C7310 (Mathematics)",
classification = "C4140 (Linear algebra); C6130B (Graphics
techniques); C7310 (Mathematics)",
corpsource = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer graphics; Interactive graphic tool;
interactive graphic tool; Large sparse matrices; large
sparse matrices; mathematics computing; matrix algebra;
optimal; Optimal solving strategy; Scrolling;
scrolling; Selective plotting; selective plotting;
solving strategy; Sorting; sorting; Sparse matrices;
sparse matrices; Sparsity pattern; sparsity pattern;
Zooming; zooming",
thesaurus = "Computer graphics; Mathematics computing; Matrix
algebra",
treatment = "P Practical",
}
@Article{DeMaris:1991:VVD,
author = "D. L. DeMaris",
title = "Visualization in a {VLSI} design automation system",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "238--243",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Problems unique to the visualization of complex,
partially automated design tasks such as VLSI system
design are reviewed, and approaches are described. The
design domain used to illustrate the approaches is
chip-level floor-planning, an iterative-refinement
design methodology for VLSI layout, routing, and timing
control. The general view structure and control
structure are described. Other visualization topics
addressed are display of evolving data, sequencing of
overlay data, an interleaved temperature-color metaphor
for view consistency and clarity, and dynamically
generated iconic measurement tools.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B1130B (Computer-aided
circuit analysis and design); C7410D (Electronic
engineering); C6130B (Graphics techniques)",
classification = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); C6130B (Graphics techniques);
C7410D (Electronic engineering)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chip-level; Chip-level floor-planning; circuit layout
CAD; circuits; engineering graphics; Evolving data;
evolving data; floor-planning; iconic; Iconic
measurement tools; integrated logic;
Iterative-refinement design; iterative-refinement
design; Logic circuits; logic circuits; measurement
tools; Overlay data; overlay data; Routing; routing;
Temperature-color metaphor; temperature-color metaphor;
Timing control; timing control; View consistency; view
consistency; VLSI; VLSI design automation system; VLSI
layout",
thesaurus = "Circuit layout CAD; Engineering graphics; Integrated
logic circuits; VLSI",
treatment = "P Practical",
}
@Article{Wejchert:1991:VPN,
author = "J. Wejchert and G. Tesauro",
title = "Visualizing processes in neural networks",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "244--253",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A real-time visualization toolkit has been designed to
study processes in neural network learning. To date,
relatively little attention has been given to
visualizing these complex, nonlinear systems. Two new
visualization methods are introduced and then applied.
One represents synaptic weight data as `bonds' of
varying length embedded in the geometrical structure of
a network. The other maps the temporal trajectory of
the system in a multidimensional configuration space as
a two-dimensional diagram. Two-dimensional graphics
were found to be sufficient for representing dynamic
neural processes. As an application, the visualization
tools are linked to simulations of networks learning
various Boolean functions. A multiwindow environment
allows different aspects of the simulation to be viewed
simultaneously using real-time animations. The
visualization toolkit can be used in a number of ways:
to see how solutions to a particular problem are
obtained; to observe how different parameters affect
learning dynamics; and to identify the decision stages
of learning.",
acknowledgement = ack-nhfb,
affiliation = "IBM Sci. Centre, Winchester, UK",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7430 (Computer engineering); C1230D (Neural nets);
C6130B (Graphics techniques); C1240 (Adaptive system
theory)",
classification = "C1230D (Neural nets); C1240 (Adaptive system
theory); C6130B (Graphics techniques); C7430 (Computer
engineering)",
corpsource = "IBM Sci. Centre, Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2D diagram; Boolean; Boolean functions; configuration
space; Dynamic neural processes; dynamic neural
processes; engineering graphics; functions; learning
systems; multidimensional; Multidimensional
configuration space; Multiwindow environment;
multiwindow environment; neural nets; Neural network
learning; neural network learning; Neural networks;
neural networks; Nonlinear systems; nonlinear systems;
real-; Real-time animations; real-time animations;
real-time visualization; Real-time visualization
toolkit; Synaptic weight data; synaptic weight data;
Temporal trajectory; temporal trajectory; time systems;
toolkit; virtual machines",
thesaurus = "Engineering graphics; Learning systems; Neural nets;
Real-time systems; Virtual machines",
treatment = "P Practical",
}
@Article{Bernaschi:1991:TVM,
author = "M. Bernaschi and E. Marinari and S. Patarnello and S.
Succi",
title = "Three-dimensional visualization of many-body system
dynamics",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "254--269",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes a graphic rendering system for use
in visualizing the behavior of three-dimensional
physical systems. The tool is general and allows the
user to characterize a great variety of phenomena. The
only requirement is that the physical system be
represented by variables defined on quantifiable
positions (sites) within a three-dimensional grid. The
variables may be discrete (e.g., binary), real, or even
complex numbers. The first part gives a technical
description of the graphic program, which is based on a
graPHIGS interface. The hardware platform consists of
an IBM 5080 graphic workstation with a 5081
high-resolution monitor which can be driven either by a
machine employing IBM System/370 architecture with
VM/XA or by a RISC System/6000 workstation running
under AIX. The second part describes three different
examples of the application of this tool: discrete spin
models, quantum chromodynamics (QCD), and
three-dimensional turbulence.",
acknowledgement = ack-nhfb,
affiliation = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0550 (Lattice theory and statistics; Ising problems);
A4780 (Instrumentation for fluid dynamics); A4725
(Turbulent flows, convection, and heat transfer);
A1235C (General properties of quantum chromodynamics
(dynamics, confinement, etc.)); C7320 (Physics and
Chemistry); C6130B (Graphics techniques)",
classification = "A0550 (Lattice theory and statistics; A1235C
(General properties of quantum chromodynamics
(dynamics, confinement, etc.)); A4725 (Turbulent flows,
convection, and heat transfer); A4780 (Instrumentation
for fluid dynamics); C6130B (Graphics techniques);
C7320 (Physics and Chemistry); Ising problems)",
corpsource = "IBM Eur. Center for Sci. and Eng. Comput., Rome,
Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D visualization; AIX; chromodynamics; colour model;
computer graphics; computing; Discrete spin models;
discrete spin models; flow visualisation; graphic;
Graphic rendering system; GraPHIGS; graPHIGS;
High-resolution monitor; high-resolution monitor; IBM
5080 graphic workstation; IBM System/370 architecture;
lattice; many-body problems; Many-body system dynamics;
many-body system dynamics; physics; quantum; Quantum
chromodynamics; rendering system; RISC System/6000;
solid modelling; theory and statistics; Turbulence;
turbulence; VM/XA",
thesaurus = "Colour model; Computer graphics; Flow visualisation;
Lattice theory and statistics; Many-body problems;
Physics computing; Solid modelling; Turbulence",
treatment = "P Practical",
}
@Article{Szelenyi:1991:VPE,
author = "F. Szelenyi and V. Zecca",
title = "Visualizing parallel execution of {FORTRAN} programs",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "270--282",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "As a first step toward the parallel execution analysis
of FORTRAN programs, a tool called the Parallel
Execution Profiler has been designed and implemented
for the graphical postexecution analysis of parallel
programs using the Parallel FORTRAN environment as a
vehicle for both implementing parallel programs and
tracing parallel events. The dynamic behavior of
parallel execution is observed interactively in color
graphs, which can be displayed concurrently with the
source code, and in statistical summaries. The paper
describes the implementation of the tool for parallel
performance analysis with the aid of a parallelized
application program from plasma physics.",
acknowledgement = ack-nhfb,
affiliation = "IBM Germany Stuttgart, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6115 (Programming support); C6140D (High level
languages); C6150G (Diagnostic, testing, debugging and
evaluating systems); C6130B (Graphics techniques)",
classification = "C6115 (Programming support); C6130B (Graphics
techniques); C6140D (High level languages); C6150G
(Diagnostic, testing, debugging and evaluating
systems)",
corpsource = "IBM Germany Stuttgart, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "color; Color graphs; computer graphics; Execution
Profiler; FORTRAN; FORTRAN program; Graphical
postexecution analysis; graphical postexecution
analysis; graphs; Parallel; Parallel execution
analysis; parallel execution analysis; Parallel
Execution Profiler; Parallel FORTRAN environment;
Parallel performance analysis; parallel performance
analysis; parallel programming; Parallel programs;
parallel programs; Plasma physics; plasma physics;
software; tools",
thesaurus = "Computer graphics; FORTRAN; Parallel programming;
Software tools",
treatment = "P Practical",
}
@Article{Schlig:1991:STI,
author = "E. S. Schlig",
title = "A 3072 $\times$ 32-stage {TDI} imaging device",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "283--287",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A 3072*32-stage TDI charge-coupled imaging device is
described. It is believed to be the first reported TDI
imager suitable for 300-pel-per-inch document scanning.
Its large photocharge capacity gives it the noise
performance and dynamic range required for high-quality
gray-scale and color imaging in publishing and museum
applications. Design options for high-resolution TDI
imagers and the uniformity enhancement provided by the
TDI mode of operation are discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5530 (Pattern recognition and computer vision
equipment)",
classification = "C5530 (Pattern recognition and computer vision
equipment)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "charge-coupled devices; document; Document scanning;
dynamic; Dynamic range; image scanners; museum
applications; Museum applications; noise performance;
Noise performance; photocharge capacity; Photocharge
capacity; publishing; Publishing; range; scanning; TDI
charge-coupled imaging device; TDI imager",
thesaurus = "Charge-coupled devices; Image scanners",
treatment = "P Practical",
}
@Article{Heidelberger:1991:TSU,
author = "P. Heidelberger and P. A. Franaszek",
title = "Traffic studies of unbuffered {Delta} networks",
journal = j-IBM-JRD,
volume = "35",
number = "1/2",
pages = "288--299",
month = jan # "\slash " # mar,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper analyzes the performance of unbuffered Delta
networks under a nonuniform ('hot-spot') traffic
pattern. Particular attention is paid to characterizing
the overflow traffic of unsuccessfully transmitted
packets. Analytic techniques are used to show that the
overflow traffic from an unbuffered packet-switched
Delta network is (fractionally) hotter than the offered
load. Simulation techniques are used to extend this
result to an unbuffered circuit-switched network with
limited retrials. In addition, the distribution of the
number of trials until a `cold' packet is successfully
delivered is shown to have a decreasing hazard rate,
which means that it becomes less and less likely with
each successive trial that a packet is delivered
successfully. The implications of these results for
hierarchical networks, a class of networks for
interconnecting a highly parallel, shared-memory
multiprocessor computer system, are discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6150C (Switching theory); C4230 (Switching theory)",
classification = "B6150C (Switching theory); C4230 (Switching
theory)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Delta network; Hierarchical networks; hierarchical
networks; MIN; multiprocessor interconnection networks;
overflow; Overflow traffic; packet switching;
packet-switched; Packet-switched Delta network;
performance evaluation; shared-memory multiprocessor
computer; Shared-memory multiprocessor computer system;
system; telecommunication traffic; traffic; Traffic
studies; traffic studies; Unbuffered circuit-switched
network; unbuffered circuit-switched network;
Unbuffered Delta networks; unbuffered Delta networks;
Unsuccessfully transmitted packets; unsuccessfully
transmitted packets",
thesaurus = "Multiprocessor interconnection networks; Packet
switching; Performance evaluation; Telecommunication
traffic",
treatment = "T Theoretical or Mathematical",
}
@Article{Nohilly:1991:PES,
author = "W. Nohilly and S. Hajek and R. Hawryluk",
title = "Preface: {Enterprise System 9000 Type 9121} Air-Cooled
Processor",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "306--306",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Hajek:1991:IES,
author = "S. F. Hajek",
title = "The {IBM Enterprise System\slash 9000 Type 9121}
air-cooled processor",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "307--312",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM Enterprise System/9000 Type 9121 air-cooled
processor achieves, with the same or reduced physical
floor space and power levels, a performance level equal
to or greater than those of previous IBM processors.
This performance level was attained by a combination of
design innovations: a new air-cooled thermal conduction
module (TCM), integration of bipolar and CMOS
technology in this TCM, the design and implementation
of a differential current switch bipolar circuit
family, integrated programmable memory subsystem
design, and extensive use of VLSI technology. The
result of these innovations was a 15-ns-cycle
air-cooled machine. The salient features and an
overview of the machine design are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C5470
(Performance evaluation and testing)",
classification = "C5420 (Mainframes and minicomputers); C5470
(Performance evaluation and testing)",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled thermal conduction module; Air-cooled
thermal conduction module; bipolar technology; Bipolar
technology; CMOS technology; cooled processor;
differential current switch bipolar circuit;
Differential current switch bipolar circuit family;
evaluation; family; IBM computers; IBM Enterprise
System/9000 Type 9121 air-; IBM Enterprise System/9000
Type 9121 air-cooled processor; integrated programmable
memory subsystem; Integrated programmable memory
subsystem; mainframes; packaging; performance;
performance level; Performance level; physical floor
space; Physical floor space; power levels; Power
levels; technology; VLSI; VLSI technology",
thesaurus = "IBM computers; Mainframes; Packaging; Performance
evaluation; VLSI",
treatment = "P Practical",
}
@Article{Eichelberger:1991:DCS,
author = "E. B. Eichelberger and S. E. Bello",
title = "Differential current switch --- High performance at
low power",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "313--320",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The recent IBM System/390 announcement includes six
high-performance air-cooled models that use a low-power
variation of emitter-coupled logic (ECL). This new
logic family, called differential current switch (DCS),
uses differential signal pairs to represent logic with
dotting to implement a complete set of logic circuits.
These DCS circuits are described in detail, and the
relative value of the DCS and ECL logic families is
discussed extensively.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); C5120 (Logic and switching
circuits)",
classification = "B1265B (Logic circuits); C5120 (Logic and switching
circuits)",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled models; Air-cooled models; current switch;
differential; Differential current switch; differential
signal pairs; Differential signal pairs; dotting;
Dotting; emitter-coupled logic; Emitter-coupled logic;
integrated logic circuits; logic; Logic; logic
circuits; Logic circuits",
thesaurus = "Emitter-coupled logic; Integrated logic circuits",
treatment = "A Application; P Practical",
}
@Article{Chu:1991:CSR,
author = "J. L. Chu and H. R. Torabi and F. J. Towler",
title = "A {128Kb CMOS} static random-access memory",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "321--329",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Describes an all-CMOS 128Kb static random-access
memory (SRAM) with emitter-coupled logic (ECL) I/O
compatibility which was designed for the air-cooled
Enterprise System/9000 processors. Access time of 6.5
ns is achieved using 0.5-$\mu$m channel length and
1.0-$\mu$m minimum geometry. Pipelining and
self-resetting circuit techniques permit the chip to
operate with cycle time less than access time. To
achieve the high-reliability requirement in the TCM
environment, a novel technique utilizing a sacrificial
substrate is used to `burn in' chips prior to their
attachment to the TCM.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage)",
classification = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage)",
corpsource = "IBM Gen. Technol. Div., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1.0 Micron; 1.0 micron; 128 Kbit; 6.5 ns; 6.5 Ns;
access time; Access time; air-cooled; Air-cooled
Enterprise System/9000 processors; Burn-in; burn-in;
circuit reliability; CMOS; CMOS integrated circuits;
cycle time; Cycle time; emitter-coupled logic;
Emitter-coupled logic; Enterprise System/9000
processors; I/O compatibility; memory; pipelining;
Pipelining; sacrificial; Sacrificial substrate;
self-resetting circuit; Self-resetting circuit
techniques; SRAM chips; static random-access; Static
random-access memory; substrate; TCM environment;
techniques",
numericalindex = "Storage capacity 1.31E+05 bit; Time 6.5E-09 s; Size
1.0E-06 m",
thesaurus = "Circuit reliability; CMOS integrated circuits; SRAM
chips",
treatment = "A Application; P Practical",
}
@Article{Knickerbocker:1991:ISA,
author = "J. U. Knickerbocker and G. B. Leung and W. R. Miller
and S. P. Young and S. A. Sands and R. F. Indyk",
title = "{IBM System\slash 390} air-cooled alumina thermal
conduction module",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "330--341",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Advances in multilayer ceramic (MLC) processing, the
use of thin-film metallurgy wiring, and enhancements in
thermal dissipation, all described in this paper,
represent significant milestones in the evolution of
microelectronic packaging technology. The IBM
System/390 air-cooled alumina thermal conduction module
(S/390 alumina TCM) utilizes a 127.5*127.5-mm MLC
substrate to interconnect as many as 121 VLSI devices
and 144 substrate-mounted decoupling capacitors. The
substrate provides an array of 648 pads for solder
connections to each device, an array of 16 pads for
solder connections to each capacitor, and an array of
2772 pins for interconnection with the next package
level and contains approximately 400 m of wiring. The
reduced thermal resistance design permits up to 600 W
of air-cooling capacity. This paper describes the S/390
alumina TCM fabrication processes and discusses the
advances they represent in processing technology,
packaging density, and performance. Comparisons to
prior technology are made.",
acknowledgement = ack-nhfb,
affiliation = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al2O3/sur Al2/sur Al/sur O3/sur O/sur Al2O3/bin
Al2/bin Al/bin O3/bin O/bin",
classcodes = "B0170J (Product packaging); C5490 (Other aspects)",
classification = "B0170J (Product packaging); C5490 (Other aspects)",
corpsource = "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled module; Air-cooled module; air-cooling
capacity; Air-cooling capacity; Al$_2$O/sub 3/; Al/sub
2/O/sub 3/; capacitors; conduction module; IBM
computers; IBM System/390; microelectronic packaging;
Microelectronic packaging; MLC; MLC substrate; modules;
multilayer ceramic; Multilayer ceramic; package level;
Package level; packaging; packaging density; Packaging
density; resistance design; S/390 module; solder
connections; Solder connections; substrate;
substrate-mounted decoupling; Substrate-mounted
decoupling capacitors; thermal; Thermal conduction
module; thermal dissipation; Thermal dissipation;
Thermal resistance design; thin-film metallurgy;
Thin-film metallurgy wiring; VLSI; VLSI devices;
wiring",
thesaurus = "IBM computers; Modules; Packaging; VLSI",
treatment = "P Practical",
}
@Article{Gani:1991:IES,
author = "V. L. Gani and M. C. Graf and R. F. Rizzolo and W. F.
Washburn",
title = "{IBM Enterprise System\slash 9000 Type 9121} model 320
air-cooled processor technology",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "342--351",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The basic component of the new IBM Enterprise System
9000 Type 9121 Model 320 processor is an air-cooled
thermal conduction module (TCM). The fabrication of
this module required the integration of new bipolar
chips, CMOS SRAM chips, and ECL and DCS logic circuitry
in a TCM that could dissipate heat by means of air
cooling. The method and details of this process of
integration are described and discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Paughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B1265B (Logic circuits);
B1265D (Memory circuits); C5490 (Other aspects); C5420
(Mainframes and minicomputers); C5120 (Logic and
switching circuits); C5320G (Semiconductor storage)",
classification = "B0170J (Product packaging); B1265B (Logic circuits);
B1265D (Memory circuits); C5120 (Logic and switching
circuits); C5320G (Semiconductor storage); C5420
(Mainframes and minicomputers); C5490 (Other aspects)",
corpsource = "IBM Data Syst. Div., Paughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled thermal conduction module; Air-cooled
thermal conduction module; bipolar chips; Bipolar
chips; circuits; CMOS; CMOS SRAM chips; DCS; ECL;
emitter-coupled logic; IBM computers; IBM Enterprise
System/9000 Type 9121 Model 320 processor; integrated
logic; logic circuitry; Logic circuitry; mainframes;
modules; packaging; SRAM chips",
thesaurus = "Emitter-coupled logic; IBM computers; Integrated logic
circuits; Mainframes; Modules; Packaging; SRAM chips",
treatment = "P Practical",
}
@Article{Weinberger:1991:ADO,
author = "A. Weinberger",
title = "An adder design optimized for {DCS} logic",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "352--356",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The basic DCS logic gate provides a two-way SELECT
function and, with modifications, a two-way XOR, OR or
AND function. Furthermore, outputs of DCS gates can be
wired together (dotted) to perform dotted SELECT, XOR,
OR, or AND functions. The versatility of this logic is
illustrated in the design of a carry-lookahead adder.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Paughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits)C5120 (Logic and switching circuits)",
classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits); C5120 (Logic and switching circuits)",
corpsource = "IBM Data Syst. Div., Paughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Adder design; adder design; adders; Carry-lookahead
adder; carry-lookahead adder; DCS logic; DCS logic
gate; Differential cascade current switch; differential
cascade current switch; dotted functions; Dotted
functions; emitter-coupled logic; function; integrated
logic circuits; logic gates; Two-way AND function;
two-way AND function; two-way OR function; Two-way OR
function; two-way SELECT; Two-way SELECT function;
Two-way XOR function; two-way XOR function",
thesaurus = "Adders; Emitter-coupled logic; Integrated logic
circuits; Logic gates",
treatment = "P Practical",
}
@Article{Curran:1991:IES,
author = "B. W. Curran and M. H. Walz",
title = "{IBM Enterprise System\slash 9000 Type 9121} system
controller and memory subsystem design",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "357--366",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A system controller supporting two processors, two
independent memory banks, and a channel subsystem has
been implemented within a single air-cooled thermal
conduction module for the IBM Enterprise System/9000
Type 9121 processors. Improvements in technology
densities, usage of CMOS and emitter-coupled logic on
the same substrate, and innovations in the system
controller design were required to achieve the
one-module objective. In addition, system reliability
is improved with a storage key error-correction code,
and storage allocation options are increased with a
combined main/expanded store design. In conjunction
with the system controller development, a new memory
subsystem has been designed for the 9121 system.
Innovative large-system memory packaging techniques and
functional changes in the data accessing methods have
culminated in a memory board which supports up to
one-gigabyte system storage.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570K (Mixed technology
integrated circuits); C5310 (Storage system design);
C6120 (File organisation); C5490 (Other aspects);
C5320G (Semiconductor storage)",
classification = "B1265D (Memory circuits); B2570K (Mixed technology
integrated circuits); C5310 (Storage system design);
C5320G (Semiconductor storage); C5490 (Other aspects);
C6120 (File organisation)",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled thermal conduction module; application
specific integrated circuits; channel subsystem;
Channel subsystem; CMOS; combined; Combined
main/expanded store design; data accessing methods;
Data accessing methods; emitter-coupled logic;
Emitter-coupled logic; IBM computers; IBM Enterprise;
IBM Enterprise System/9000 Type 9121 processors; key
error-correction code; main/expanded store design;
memory architecture; memory banks; Memory banks; memory
subsystem; Memory subsystem; modules; one-module
objective; One-module objective; packaging; Packaging
techniques; single; Single air-cooled thermal
conduction module; storage; storage allocation; Storage
allocation; Storage key error-correction code; storage
management chips; system controller; System controller;
System/9000 Type 9121 processors; techniques;
technology densities; Technology densities",
thesaurus = "Application specific integrated circuits; IBM
computers; Memory architecture; Modules; Packaging;
Storage allocation; Storage management chips",
treatment = "A Application; P Practical",
}
@Article{Slegel:1991:DPI,
author = "T. J. Slegel and R. J. Veracca",
title = "Design and performance of the {IBM Enterprise
System\slash 9000 Type 9121 Vector Facility}",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "367--381",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The design of the IBM Enterprise System/9000 Type 9121
Vector Facility is described and its performance is
evaluated in this paper. The Vector Facility design
adheres to the architecture developed for the 3090
vector facilities. The original design objectives and
associated architecture are reviewed. Vector operations
and design details are discussed, and specific
performance results are shown.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220P (Parallel architecture); C5470 (Performance
evaluation and testing)",
classification = "C5220P (Parallel architecture); C5470 (Performance
evaluation and testing)",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3090 vector; 3090 Vector facilities; design
objectives; Design objectives; evaluation; facilities;
IBM computers; IBM Enterprise; IBM Enterprise
System/9000 Type 9121 Vector Facility; parallel
architectures; Parallel architectures; performance;
performance results; Performance results; System/9000
Type 9121 Vector Facility; vector operations; Vector
operations",
thesaurus = "IBM computers; Parallel architectures; Performance
evaluation",
treatment = "P Practical",
}
@Article{Turgeon:1991:TAA,
author = "P. R. Turgeon and A. R. Steel and M. R. Charlebois",
title = "Two approaches to array fault tolerance in the {IBM
Enterprise System\slash 9000 Type 9121} processor",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "382--389",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The system design of the IBM Enterprise System/9000
Type 9121 processor was intended to provide high
performance and dense packaging within an air-cooled
system. Packaging and technology factors had a major
influence on the fault-tolerance strategies chosen.
This paper describes the effect that this design point
had on the fault-tolerance capabilities of two critical
9121 array applications. Although the design challenges
faced by these array applications initially appeared to
be very similar, the resulting solutions represent very
different designs with differing fault-tolerance
capabilities. The rationale for these approaches is
given, and the error-correction algorithms are
described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5470 (Performance evaluation and testing); C5420
(Mainframes and minicomputers); C5320G (Semiconductor
storage)",
classification = "C5320G (Semiconductor storage); C5420 (Mainframes
and minicomputers); C5470 (Performance evaluation and
testing)",
corpsource = "IBM Data Syst. Div., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air-cooled system; Air-cooled system; algorithms;
array fault tolerance; Array fault tolerance; buffer
storage; error-correction; Error-correction algorithms;
fault tolerant computing; IBM computers; IBM Enterprise
System/9000 Type 9121; IBM Enterprise System/9000 Type
9121 processor; mainframes; packaging; Packaging;
processor",
thesaurus = "Buffer storage; Fault tolerant computing; IBM
computers; Mainframes",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Sarma:1991:EST,
author = "S. Sarma",
title = "Enhanced self-test techniques for {VLSI} systems
applied to the {IBM Enterprise System\slash 9000 Type
9121} processor",
journal = j-IBM-JRD,
volume = "35",
number = "3",
pages = "390--399",
month = may,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper discusses the problems associated with
obtaining adequate test coverage from random self-test
for thermal conduction modules (TCMs) in the air-cooled
IBM Enterprise System/9000 Type 9121 processors. Each
9121 TCM contains approximately a quarter of a million
circuits. The present complexity of the TCMs made
previous testing methods such as chip-in-place (CIP)
testing enviable. The solution was to apply self-test
techniques to the 9121 TCMs during the manufacturing
process. Analytical and simulation techniques were used
to predict the random-pattern testability of the TCMs.
The results of the self-test process for the five
distinct 9121 processor TCMs are presented. Methods of
identifying and modifying random-pattern-resistant
logic structures are discussed. It is also proposed
that a hybrid approach combining random self-test with
deterministic test generation can be used to enhance
testability.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570
(Semiconductor integrated circuits); B0170E (Production
facilities and engineering); C5130 (Microprocessor
chips); C5210B (Computer-aided logic design)",
classification = "B0170E (Production facilities and engineering);
B1265F (Microprocessors and microcomputers); B2570
(Semiconductor integrated circuits); C5130
(Microprocessor chips); C5210B (Computer-aided logic
design)",
corpsource = "IBM Data Syst. Div., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "air cooling; Air cooling; application specific
integrated circuits; built-in self; deterministic test
generation; Deterministic test generation; Enterprise
System/9000 Type 9121 processor; IBM; IBM computers;
IBM Enterprise System/9000 Type 9121 processor; logic
structures; logic testing; manufacturing; Manufacturing
process; microprocessor chips; process; production
testing; random self-; Random self-test;
random-pattern-resistant; Random-pattern-resistant
logic structures; self-test techniques; Self-test
techniques; simulation techniques; Simulation
techniques; TCMs; test; thermal conduction modules;
Thermal conduction modules; VLSI; VLSI systems",
thesaurus = "Application specific integrated circuits; Built-in
self test; IBM computers; Logic testing; Microprocessor
chips; Production testing; VLSI",
treatment = "P Practical",
}
@Article{Pennington:1991:MNP,
author = "K. S. Pennington",
title = "Making negatives and plates for printing by
electroerosion: Introduction and overview",
journal = j-IBM-JRD,
volume = "35",
number = "4",
pages = "458--465",
month = jul,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The most familiar electroerosion printers operate by
removing the whitish or silvery aluminum overlayer from
discrete areas of a special paper so as to reveal a
black underlayer. The direct negative/direct plate
(DNP) material described is a new dual-function
printing material which, when employed together with an
electroerosion printer, allows direct generation of
negatives or (short-run) offset printing plates
suitable for use in printing and publishing
applications. The DNP material has been specifically
developed for use with the IBM 4250 electroerosion
printer family, allowing these printers to generate
negatives, plates, and camera-ready copy directly from
the computer with no chemical processing.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B8660 (Printing industries); C5550 (Printers, plotters
and other hard-copy output devices)",
classification = "B8660 (Printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "camera-ready; Camera-ready copy; copy; direct
negative/direct plate material; Direct negative/direct
plate material; dual-function printing material;
Dual-function printing material; electroerosion;
Electroerosion; etching; IBM 4250; offset printing
plates; Offset printing plates; printers; Printers;
printing; Printing; publishing; Publishing",
thesaurus = "Etching; Printers; Printing",
treatment = "G General Review; P Practical",
}
@Article{Cohen:1991:MNPa,
author = "M. S. Cohen and K. S. Pennington",
title = "Making negatives and plates for printing by
electroerosion. {I}. {Physical} principles",
journal = j-IBM-JRD,
volume = "35",
number = "4",
pages = "466--488",
month = jul,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Electroerosion printing involves removal of the
aluminum overlayer from selected areas of a
black-coated paper. `Direct negatives' as well as
`direct plate' for use in offset lithographic printing
may also be generated by electroerosion if a clear
polymer sheet is used as the substrate instead of
paper, and the black base layer is omitted. If such a
substrate is metallized and written by electroerosion,
the desired direct negative is created in principle
since the metal stops transmitted light and the
polyester does not. The direct plate is simultaneously
created in principle since the aluminum is hydrophilic
and the polyester is hydrophobic. Practical realization
of these concepts required studies of the physical
principles of the processes involved, which led to
techniques for avoidance of mechanical scratching of
the aluminum film during writing. For writing, a
two-phase driver was used, in which the first phase
provided a high current for Joule heating with
consequent breaking of direct local aluminum-stylus
contacts, while the second phase provided an arc which
removed the remainder of the aluminum under the
stylus.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al/int Al/el",
classcodes = "B8660 (Printing industries); C5550 (Printers, plotters
and other hard-copy output devices)",
classification = "B8660 (Printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Al film; Arc; arc; Clear polymer sheet; clear polymer
sheet; Electroerosion; electroerosion; etching;
heating; Hydrophilic; hydrophilic; Hydrophobic;
hydrophobic; Joule; Joule heating; lithographic
printing; Negatives; negatives; offset; Offset
lithographic printing; Plates; plates; Polyester;
polyester; printers; Printing; printing; Two-phase
driver; two-phase driver; Writing; writing",
thesaurus = "Etching; Printers; Printing",
treatment = "P Practical",
}
@Article{Cohen:1991:MNPb,
author = "M. S. Cohen and A. Afzali and E. E. Simonyi and M.
Desai and K. S. Pennington",
title = "Making negatives and plates for printing by
electroerosion. {II}. {Larger-scale} fabrication and
testing",
journal = j-IBM-JRD,
volume = "35",
number = "4",
pages = "489--511",
month = jul,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "For pt.I see ibid., vol.35, no.4 p.466-88 (1991).
Concerns larger-scale fabrication techniques,
characterization methods, and the results of tests,
together with their interpretation. Major problems
which were encountered are also presented with their
solutions. Sheet material for the direct
negative/direct plate (DNP) was made by (1) Coating
polyester rolls with an underlayer. The underlayer
coating fluid contained silica, a cellulosic binder, a
saturated polyester dispersant, and an isocyanate
cross-linker. The coating fluid was carefully milled to
control silica particle size before coating. (2) Curing
the rolls either at ambient or elevated temperature.
(3) Calendering the underlayer. (4) Vacuum-depositing
an aluminum film. (5) Coating with an overlayer
containing graphite and a binder. Maintenance of good
control of material characteristics was found essential
for acceptable functional performance. After
fabrication, functional testing of the DNP material was
carried out on the IBM 4250 printer in order to study
the major performance problems of scratching, writing
failure, head wear, and gouging.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B8660 (Printing industries); C5550 (Printers, plotters
and other hard-copy output devices)",
classification = "B8660 (Printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Calendering; calendering; Cellulosic binder;
cellulosic binder; Curing; curing; Direct
negative/direct plate; direct negative/direct plate;
etching; Functional performance; functional
performance; Gouging; gouging; Head wear; head wear;
IBM 4250 printer; Isocyanate cross-linker; isocyanate
cross-linker; Overlayer; overlayer; polyester;
Polyester rolls; printers; printing; rolls; Saturated
polyester dispersant; saturated polyester dispersant;
Scratching; scratching; Silica particle size; silica
particle size; Writing failure; writing failure",
thesaurus = "Etching; Printers; Printing",
treatment = "P Practical",
}
@Article{Cohen:1991:MNPc,
author = "M. S. Cohen and A. Afzali and E. E. Simonyi and K. S.
Pennington",
title = "Making negatives and plates for printing by
electroerosion. {III}. {Use} of the direct negative and
direct plate",
journal = j-IBM-JRD,
volume = "35",
number = "4",
pages = "512--534",
month = jul,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "For pt.II see ibid., vol.35, no.4 p.489-511 (1991).
Issues related to the practical usage in the pressroom
of both the direct negative and direct plate are
discussed. Two concerns associated with the usage of
the direct negative during platemaking are treated: (1)
the effect of light transmission through defects
(voids) in the aluminum film, and (2) the effect of
light transmission directly through the aluminum. These
concerns may be addressed respectively by careful
fabrication of the material and careful control of the
exposure conditions during platemaking. Two aspects of
the usage of the direct plate are considered: (1) the
need for a simple prepress `activation' treatment, and
(2) press-life limitation caused by wear of the direct
plate on the press. Passing a direct plate through an
activator solution immediately prior to mounting it on
the press prevented scumming in the image area and
blinding in the background (nonimage) area. The life on
the press of the direct plate is limited by the wearing
away of the aluminum from the background areas, thereby
causing scumming. Changes in the structure of the
direct plate which could prolong press life were
investigated.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al/int Al/el",
classcodes = "B8660 (Printing industries); C5550 (Printers, plotters
and other hard-copy output devices)",
classification = "B8660 (Printing industries); C5550 (Printers,
plotters and other hard-copy output devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Al film; direct; Direct negative; direct negative;
Direct plate; Electroerosion; electroerosion; etching;
Exposure conditions; exposure conditions; Image area;
image area; Light transmission; light transmission;
plate; Platemaking; platemaking; Press-life limitation;
press-life limitation; Pressroom; pressroom; printers;
Printing; printing; Scumming; scumming; Wear; wear",
thesaurus = "Etching; Light transmission; Printers; Printing",
treatment = "P Practical",
}
@Article{Musgrave:1991:AFL,
author = "F. K. Musgrave and B. B. Mandelbrot",
title = "The art of fractal landscapes",
journal = j-IBM-JRD,
volume = "35",
number = "4",
pages = "535--536, 539",
month = jul,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Synthetic images of fractal landscapes have moved
beyond science to enter the domain of `art for art's
sake'. The authors discuss some of the ramifications of
this artistic aspect: improving the fractal description
of terrains, adding fractal textures to surfaces, and
using parallel computers. They illuminate the
peculiarities of attaining artistic self-expression in
representational imagery purely through formal logic,
and discuss its import.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Comput. Sci. and Math., Yale Univ., New
Haven, CT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7820 (Humanities); C6130B (Graphics techniques)",
classification = "C6130B (Graphics techniques); C7820 (Humanities)",
corpsource = "Dept. of Comput. Sci. and Math., Yale Univ., New
Haven, CT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Art; art; Artistic self-expression; artistic
self-expression; computer graphics; Formal logic;
formal logic; fractal; fractal landscapes; Fractal
landscapes; Fractal textures; fractals; Parallel
computers; parallel computers; representational
imagery; Representational imagery; synthetic images;
Synthetic images; terrains; Terrains; textures",
thesaurus = "Art; Computer graphics; Fractals",
treatment = "A Application; P Practical",
}
@Article{Kleinfelder:1991:PPP,
author = "W. Kleinfelder",
title = "Preface: Papers on Parallel Processing",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "571--572",
month = sep,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Shea:1991:IVV,
author = "D. G. Shea and W. W. Wilcke and R. C. Booth and D. H.
Brown and Z. D. Christidis and M. E. Giampapa and G. B.
Irwin and T. T. Murakami and V. K. Naik and F. T. Tong
and P. R. Varker and D. J. Zukowski",
title = "The {IBM Victor V256} partitionable multiprocessor",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "573--590",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Victor V256 is a partitionable message-passing
multiprocessor with 256 processors, designed and in use
at the IBM Thomas J. Watson Research Center. The goals
are to explore computer architectures based on the
message-passing model and to use these architectures to
solve real applications. The authors present the
architecture of the Victor system, particularly its
partitioning and nonintrusive monitoring. They discuss
some of the programming environments on Victor, such as
E-kernel, an embedding kernel developed for the support
of program mapping and network reconfiguration. They
review applications developed and run on Victor and
discuss a few in depth, concluding with insights gained
from this project.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C5220P
(Parallel architecture)",
classification = "C5220P (Parallel architecture); C5440
(Multiprocessor systems and techniques)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architectures; Computer architectures; computer
architectures; E-kernel; embedding; Embedding kernel;
IBM computers; kernel; monitoring; multiprocessing
systems; Network reconfiguration; network
reconfiguration; nonintrusive; Nonintrusive monitoring;
parallel; Partitionable message-passing multiprocessor;
partitionable message-passing multiprocessor;
Partitioning; partitioning; Program mapping; program
mapping; Programming environments; programming
environments; Victor V256",
thesaurus = "IBM computers; Multiprocessing systems; Parallel
architectures",
treatment = "P Practical",
}
@Article{Shimizu:1991:DCT,
author = "S. Shimizu and N. Oba and T. Nakada and M. Ohara and
A. Moriwaki",
title = "Design choices for the {TOP}-1 multiprocessor
workstation",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "591--602",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A snoopy-cache-based multiprocessor workstation called
TOP-1 (Tokyo research parallel processor-1) was
developed to evaluate multiprocessor architecture
design choices as well as to conduct research on
operating systems, compilers, and applications for
multiprocessor workstations. TOP-1 is a ten-way
multiprocessor using the Intel 80386 microprocessor
chip and the Weitek WTL 1167 floating-point coprocessor
chip. It is currently running under a multiprocessor
version of AIX. Research interest was focused on the
design of an effective snoopy cache (all caches monitor
all memory-cache traffic) system and the quantitative
evaluation of its performance. One of the unique
aspects of the TOP-1 design is that the cache supports
four different, original snoopy protocols, which may
coexist in the system. To evaluate the performance, the
authors implemented a hardware statistics monitor that
gathers statistical data. The paper focuses mainly on
the TOP-1 cache design-its protocol, and its evaluation
by means of the statistics monitor.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Tokyo Res. Lab., IBM Japan Ltd.,
Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C5470
(Performance evaluation and testing)",
classification = "C5440 (Multiprocessor systems and techniques); C5470
(Performance evaluation and testing)",
corpsource = "IBM Res. Div., Tokyo Res. Lab., IBM Japan Ltd.,
Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AIX; buffer storage; chip; Compilers; compilers;
development systems; Hardware statistics monitor;
hardware statistics monitor; IBM; IBM computers; Intel
80386 microprocessor; Intel 80386 microprocessor chip;
multiprocessing systems; multiprocessor; Multiprocessor
architecture design choices; multiprocessor
architecture design choices; Multiprocessor
workstation; multiprocessor workstation; Operating
systems; operating systems; performance evaluation;
Snoopy protocols; snoopy protocols; snoopy-cache-based;
Snoopy-cache-based multiprocessor; TOP-1; Weitek WTL
1167 floating-point coprocessor chip; workstations",
thesaurus = "Buffer storage; Development systems; IBM computers;
Multiprocessing systems; Performance evaluation;
Workstations",
treatment = "P Practical",
}
@Article{Franaszek:1991:HIM,
author = "P. A. Franaszek and C. J. Georgiou and A. N. Tantawi",
title = "Hierarchically interconnected multiprocessors",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "603--616",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The design of interconnection networks is a central
problem in parallel computing, especially for
shared-memory systems, where network latency, or delay,
is one factor that limits system size. The paper
discusses aspects of one particular approach to network
structure, a design comprising a multiplicity of
subnetworks that form a hierarchy of paths. The
hierarchy includes fast paths that are used in the
absence of contention, and alternate paths with
contention resolution. That is, just as in the case of
a memory hierarchy, the fastest component of the
hierarchy that can provide the desired function is
utilized at a given time. The viability and robustness
of hierarchical networks is studied first by examining
circuit and implementation issues, and then by
considering performance modelling and analysis. The
overall performance of the hierarchy is shown to be
close to that of a contention-free network of fast
paths.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230M (Multiprocessor interconnection); C5220P
(Parallel architecture)",
classification = "C4230M (Multiprocessor interconnection); C5220P
(Parallel architecture)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computing; contention-; Contention-free network;
Delay; delay; delays; free network; Hierarchical
networks; hierarchical networks; Interconnection
networks; interconnection networks; multiprocessor
interconnection networks; Network latency; network
latency; parallel; Parallel computing; Parallel
machines; parallel machines; Performance modelling;
performance modelling; Shared-memory systems;
shared-memory systems",
thesaurus = "Delays; Multiprocessor interconnection networks",
treatment = "T Theoretical or Mathematical",
}
@Article{Bryant:1991:OSS,
author = "R. M. Bryant and H.-Y. Chang and B. S. Rosenburg",
title = "Operating system support for parallel programming on
{RP3}",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "617--634",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "RP3, the Research Parallel Processing Prototype, was a
research vehicle for exploring the hardware and
software aspects of highly parallel computation. RP3
was a shared-memory machine that was designed to be
scalable to 512 processors; a 64-processor machine was
in operation from October 1988 through March 1991. A
parallel-programming environment based on the Mach
operating system was developed, and a variety of
programming models were tested on the machine. To help
user programs realize the full potential of parallelism
on RP3, the RP3 operating system was extended to
support such RP3 architectural features as noncoherent
caches, local and interleaved storage, and a hardware
performance monitor. The system included explicit
job-scheduling and processor-allocation facilities,
facilities for exploiting the RP3 memory hierarchy, and
performance-data collection and logging facilities. The
paper describes these components of the RP3 operating
system, provides the rationale for the design decisions
that were made, and discusses the implementation of
these operating system facilities.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems); C6150J (Operating
systems); C6110P (Parallel programming); C6115
(Programming support)",
classification = "C6110P (Parallel programming); C6115 (Programming
support); C6150J (Operating systems); C6150N
(Distributed systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "allocation; Explicit job-scheduling; explicit
job-scheduling; hardware performance; Hardware
performance monitor; Mach operating system; monitor;
multiprocessing programs; Noncoherent caches;
noncoherent caches; operating systems (computers);
Parallel programming; parallel programming;
Processor-allocation; processor-allocation; programming
environments; Programming models; programming models;
Prototype; Research Parallel Processing; Research
Parallel Processing Prototype; resource; RP3;
scheduling; Shared-memory machine; shared-memory
machine",
thesaurus = "Multiprocessing programs; Operating systems
[computers]; Parallel programming; Programming
environments; Resource allocation; Scheduling",
treatment = "P Practical",
}
@Article{Kimelman:1991:RPV,
author = "D. N. Kimelman and T. A. Ngo",
title = "The {RP3} program visualization environment",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "635--651",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The performance promised for parallel systems often
proves to be somewhat elusive. The paper discusses one
important technique for improving the performance of
parallel software: program visualization-helping
programmers visualize the real behavior of an
application or system by presenting its state and
progress in a continuous graphic fashion. An
environment for visualization of program execution is
described. Within this visualization environment,
programmers dynamically establish views of the behavior
of a program in execution and watch for trends,
anomalies, and correlations as information is
displayed. By continually refining the view of the
program and replaying the execution of the program,
programmers can gain an understanding of program
(mis)behavior. This is essential for the debugging,
performance analysis, and tuning of parallel software.
Results from visualization of systems and applications
running on the RP3, an experimental shared-memory
multiprocessor, are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6110P (Parallel programming); C6150N (Distributed
systems); C6115 (Programming support); C6150G
(Diagnostic, testing, debugging and evaluating
systems)",
classification = "C6110P (Parallel programming); C6115 (Programming
support); C6150G (Diagnostic, testing, debugging and
evaluating systems); C6150N (Distributed systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Debugging; debugging; environments; multiprocessor;
parallel programming; Parallel software; parallel
software; Performance analysis; performance analysis;
program diagnostics; programming; RP3 program
visualization environment; shared-memory; Shared-memory
multiprocessor; Tuning; tuning; visual programming",
thesaurus = "Parallel programming; Program diagnostics; Programming
environments; Visual programming",
treatment = "P Practical",
}
@Article{Ammann:1991:PPC,
author = "E. M. Ammann and R. R. Berbec and G. Bozman and M.
Faix and G. A. Goldrian and J. A. {Pershing, Jr.} and
J. Ruvolo-Chong and F. Scholz",
title = "The {Parallel Processing Compute Server}",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "653--666",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The Parallel Processing Compute Server (PPCS) is a
distributed-memory multiprocessing system consisting of
System/370 microprocessors (33 at present)
interconnected through a matrix switch. The paper
describes the hardware configuration, the extensions to
the System/370 instruction set that are provided to
support the distributed memory and interprocessor
signaling, the modifications to the VM/SP operating
system that allow it to run effectively on many closely
coupled processors (most of which have no disks), and
the application-support layer, which permits FORTRAN
programs to take advantage of the highly parallel
environment. Development of the PPCS is a joint effort
of the IBM Boblingen Development Laboratory and the IBM
Thomas J. Watson Research Center. A prototype PPCS has
been installed at CERN.",
acknowledgement = ack-nhfb,
affiliation = "IBM Data Syst. Div., Dev. Lab., Boblingen, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C6150N
(Distributed systems); C6110P (Parallel programming)",
classification = "C5440 (Multiprocessor systems and techniques);
C6110P (Parallel programming); C6150N (Distributed
systems)",
corpsource = "IBM Data Syst. Div., Dev. Lab., Boblingen, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application-support layer; Application-support layer;
CERN; distributed-memory; Distributed-memory
multiprocessing system; FORTRAN; FORTRAN programs; IBM
computers; instruction set; Instruction set;
instruction sets; interprocessor signaling;
Interprocessor signaling; matrix; Matrix switch;
multiprocessing system; multiprocessing systems;
operating system; operating systems (computers);
parallel environment; Parallel environment; Parallel
Processing Compute Server; parallel programming; PPCS;
programs; switch; System/370 microprocessors; VM/SP;
VM/SP operating system",
thesaurus = "IBM computers; Instruction sets; Multiprocessing
systems; Operating systems [computers]; Parallel
programming",
treatment = "P Practical",
}
@Article{Scarborough:1991:CIE,
author = "L. J. Scarborough and R. G. Scarborough and S. W.
White",
title = "Clustering {IBM Enterprise System\slash 3090}
computers for parallel execution of {FORTRAN}
programs",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "667--679",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Two IBM Enterprise System/3090 Model 600J computer
systems, each with six processors capable of executing
vector and scalar instructions, have been connected
into a cluster for parallel execution of single FORTRAN
programs. The clustering is achieved through a
combination of software and hardware. When enabled for
parallel execution and allowed to use all twelve
processors in the cluster, FORTRAN programs have run as
much as 11.7 times faster than when run on a single
processor. The combined hardware and software
technology is called IBM Clustered FORTRAN. It was
achieved by modifying existing technology quickly to
provide new capabilities. The paper discusses the
modifications and the motivations behind them. It
summarizes the performance of several applications
executed with Clustered FORTRAN. Finally, it describes
how clustering has been used to improve performance in
novel ways.",
acknowledgement = ack-nhfb,
affiliation = "IBM Sci. Center, Palo Alto, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C6110P
(Parallel programming); C6150N (Distributed systems);
C6140D (High level languages)",
classification = "C5440 (Multiprocessor systems and techniques);
C6110P (Parallel programming); C6140D (High level
languages); C6150N (Distributed systems)",
corpsource = "IBM Sci. Center, Palo Alto, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "execution; FORTRAN; FORTRAN programs; IBM Clustered
FORTRAN; IBM computers; IBM Enterprise System/3090;
multiprocessing programs; multiprocessing systems;
parallel; Parallel execution; parallel programming;
purpose computers; special",
thesaurus = "FORTRAN; IBM computers; Multiprocessing programs;
Multiprocessing systems; Parallel programming; Special
purpose computers",
treatment = "P Practical",
}
@Article{Lorie:1991:EDP,
author = "R. A. Lorie and J.-J. Daudenarde and J. W. Stamos and
H. C. Young",
title = "Exploiting database parallelism in a message-passing
multiprocessor",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "681--695",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Parallel processing may well be the only means of
satisfying the long-term performance requirements for
database systems: an increase in throughput for
transactions and a drastic decrease in response time
for complex queries. The authors review various
alternatives, and then focus entirely on exploiting
parallel-processing configurations in which
general-purpose processors communicate only via message
passing. The database is partitioned among the
processors. This approach looks promising but offers
challenging problems. The paper reports on solutions to
some of them: how to express strategies for efficiently
executing complex queries, how to minimize overhead in
operations such as parallel joins and sorts, and how to
deal with transaction management in a highly
distributed system. The paper ends with a discussion of
the lessons learned from exercising a prototype
developed in IBM Research.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6160B (Distributed DBMS); C6110P (Parallel
programming)",
classification = "C6110P (Parallel programming); C6160B (Distributed
DBMS)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Complex queries; complex queries; Database
parallelism; database parallelism; distributed
databases; Distributed system; distributed system; IBM;
IBM Research; Message-passing multiprocessor;
message-passing multiprocessor; multiprocessing
systems; Overhead; overhead; parallel; Parallel joins;
parallel joins; programming; Research; Response time;
response time; Sorts; sorts; Transaction management;
transaction management; transaction processing",
thesaurus = "Distributed databases; Multiprocessing systems;
Parallel programming; Transaction processing",
treatment = "P Practical",
}
@Article{Reuter:1991:MSB,
author = "R. Reuter and U. Scharffenberger and J. Schule",
title = "Multiplication of a symmetric banded matrix by a
vector on a vector multiprocessor computer",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "697--706",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes how to vectorize and parallelize
the multiplication of a symmetric banded matrix by a
vector, on a vector multiprocessor. The ideas presented
involve two packed-band-storage schemes, and
implementations for both schemes are studied. The best
among the uniprocessor solutions proposed achieves a
maximum of 37.1 Mflops on an IBM Enterprise System/3090
400E with Vector Facility (VF). For one of the schemes,
a parallel implementation on an IBM 3090 VF
multiprocessor is presented, and time measurements are
discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Germany, Heidelberg Sci. Center, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4140 (Linear algebra); C4240P (Parallel programming
and algorithm theory)",
classification = "C4140 (Linear algebra); C4240P (Parallel programming
and algorithm theory)",
corpsource = "IBM Germany, Heidelberg Sci. Center, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "37.1 MFLOPS; IBM 3090 VF; IBM 3090 VF multiprocessor;
IBM Enterprise; IBM Enterprise System/3090 400E; matrix
algebra; Multiplication; multiplication;
multiprocessor; Packed-band-storage schemes;
packed-band-storage schemes; parallel algorithms;
pipeline processing; Symmetric banded matrix; symmetric
banded matrix; System/3090 400E; Time measurements;
time measurements; Vector facility; vector facility;
Vector multiprocessor computer; vector multiprocessor
computer",
numericalindex = "Computer speed 3.71E+07 FLOPS",
thesaurus = "Matrix algebra; Parallel algorithms; Pipeline
processing",
treatment = "T Theoretical or Mathematical",
}
@Article{Johnson:1991:WBC,
author = "T. A. Johnson and D. J. Zukowski",
title = "Waveform-relaxation based circuit simulation on the
{Victor V256} parallel processor",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "707--720",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Present-day circuit-analysis tools permit designers to
verify performance for circuits consisting of up to
10000 transistors. However, current designs often
exceed several tens of thousands and even hundreds of
thousands of transistors. The gap between the number of
transistors that can be simulated and the number per
design inhibits proper analysis prior to manufacturing,
yet incomplete analysis often overlooks design flaws
and forces redesign, resulting in increased costs and
longer development times. This gap is expected to widen
in the foreseeable future. To help close the
ever-increasing simulation/design gap, the authors have
developed an experimental parallel circuit simulator,
WR V256, for the Victor V256 distributed-memory
parallel processor. WR V256 has been used to analyze
circuits from fewer than 300 to more than 180000
MOSFETs. WR V256 was originally based on a
Gauss--Seidel relaxation algorithm, which was later
replaced with a bounded-chaotic one in order to achieve
good parallel speedups for a wider variety of circuits.
At this time, speedups of up to 190 have been observed
for large circuits.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560R (Insulated gate field effect transistors);
B1130B (Computer-aided circuit analysis and design);
B2570F (Other MOS integrated circuits); C7410D
(Electronic engineering)",
classification = "B1130B (Computer-aided circuit analysis and design);
B2560R (Insulated gate field effect transistors);
B2570F (Other MOS integrated circuits); C7410D
(Electronic engineering)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bounded chaotic relaxation; bounded chaotic
relaxation; circuit analysis computing; circuit
simulator; Circuit-analysis tools; circuit-analysis
tools; Design flaws; design flaws; distributed-memory
parallel; Distributed-memory parallel processor;
Gauss--Seidel relaxation; insulated gate field effect;
MOS integrated circuits; MOSFETs; parallel; Parallel
circuit simulator; parallel processing; processor;
transistors; Victor V256 parallel; Victor V256 parallel
processor; VLSI; WR V256",
thesaurus = "Circuit analysis computing; Insulated gate field
effect transistors; MOS integrated circuits; Parallel
processing; VLSI",
treatment = "P Practical",
}
@Article{Flatt:1991:FRU,
author = "H. P. Flatt",
title = "Further results using the overhead model for parallel
systems",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "721--726",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A performance model that takes into consideration the
overhead incurred in the use of a parallel system is
used to show that the maximum value of the speedup
achieved by the parallel system for a fixed problem may
be much smaller than the number of processors required
to achieve that value. It is also shown that under
certain conditions, the problem size may be varied so
as to achieve a speedup closely approximating the
number of processors used.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5470 (Performance evaluation and testing); C5440
(Multiprocessor systems and techniques)",
classification = "C5440 (Multiprocessor systems and techniques); C5470
(Performance evaluation and testing)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Amdahl model; model; Overhead; overhead; Overhead
model; overhead model; parallel machines; Parallel
systems; parallel systems; performance; performance
evaluation; Performance model; Problem size; problem
size",
thesaurus = "Parallel machines; Performance evaluation",
treatment = "T Theoretical or Mathematical",
}
@Article{Canetti:1991:PCP,
author = "R. Canetti and L. P. Fertig and S. A. Kravitz and D.
Malki and R. Y. Pinter and S. Porat and A. Teperman",
title = "The parallel {C} ({pC}) programming language",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "727--741",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors describe pC (parallel C), an extension of
the ANSI C programming language to support medium- to
large-grain parallel programming in both shared- and
distributed-memory environments. pC aims to make
programming for parallel processors accessible to the C
community by enriching the C programming model with a
small set of constructs supporting parallelism. pC
supports shared- and distributed-memory environments
via a hierarchical computational model. A pC
application comprises a static collection of tasks with
disjoint memory spaces. A dynamic collection of threads
runs within each task, sharing the data and code of the
task. Language constructs specify concurrent execution
of threads within a single task. Additional language
constructs specify the interactions between threads
through the following mechanisms: initiation of threads
in remote tasks by remote function call, mailbox-based
message passing, and synchronization primitives. The
paper introduces the computational model and language
constructs of pC and describes a prototype pC compiler
and run-time system for the Mach operating system.
Several program examples illustrate the utility of pC
constructs.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Comput. Sci., Technion-Israel Inst. of
Technol., Haifa, Israel",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6110P (Parallel
programming); C6150C (Compilers, interpreters and other
processors)",
classification = "C6110P (Parallel programming); C6140D (High level
languages); C6150C (Compilers, interpreters and other
processors)",
corpsource = "Dept. of Comput. Sci., Technion-Israel Inst. of
Technol., Haifa, Israel",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ANSI C programming language; C language; C
programming; C programming model; Disjoint memory
spaces; disjoint memory spaces; Distributed-memory;
distributed-memory; function call; Hierarchical
computational model; hierarchical computational model;
Language constructs; language constructs; Mach; Mach
operating system; Mailbox-based message passing;
mailbox-based message passing; model; operating system;
Parallel C; parallel C; parallel languages; Parallel
programming; parallel programming; Parallelism;
parallelism; PC; pC; PC compiler; pC compiler; program
compilers; remote; Remote function call; Run-time
system; run-time system; Shared memory; shared memory;
Synchronization; synchronization; Tasks; tasks;
Threads; threads",
thesaurus = "C language; Parallel languages; Program compilers",
treatment = "P Practical",
}
@Article{Hummel:1991:LSN,
author = "S. F. Hummel and E. Schonberg",
title = "Low-overhead scheduling of nested parallelism",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "743--765",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Nested parallelism has the potential not only to
permit more parallelism than non-nested parallelism,
but to result in better load balancing. However, nested
parallelism will not be profitable unless the overhead
of scheduling nested parallel constructs can be made
nonprohibitive. Previous implementations of nested
parallel constructs have been fairly expensive and
therefore have not been able to exploit fine-grained
nested parallelism. The authors describe a run-time
system that schedules a large subset of nested parallel
constructs-those that run until completion without
blocking-with very little overhead. The run-time system
is built around a novel scheduling policy and work
queue. The scheduling policy permits efficient
stack-based local-memory storage allocation for task
data, which is particularly efficient for
multiprocessor architectures with both shared and local
memory, such as the RP3. The shared, nonlocking work
queue allows processors to obtain tasks in just a few
instructions, without sacrificing load balancing.",
acknowledgement = ack-nhfb,
affiliation = "Sch. of Comput. Sci. and Electr. Eng., Polytech.
Univ., New York, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems); C6110P (Parallel
programming)",
classification = "C6110P (Parallel programming); C6150N (Distributed
systems)",
corpsource = "Sch. of Comput. Sci. and Electr. Eng., Polytech.
Univ., New York, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "allocation; data; Fine-grained nested parallelism;
fine-grained nested parallelism; Load balancing; load
balancing; multiprocessing programs; Multiprocessor
architectures; multiprocessor architectures; Nested
parallelism; nested parallelism; Overhead; overhead;
parallel programming; queue; resource; RP3; Run-time
system; run-time system; Scheduling; scheduling;
Stack-based local-memory storage allocation;
stack-based local-memory storage allocation; task; Task
data; work; Work queue",
thesaurus = "Multiprocessing programs; Parallel programming;
Resource allocation; Scheduling",
treatment = "P Practical",
}
@Article{Ching:1991:EAP,
author = "W.-M. Ching and D. Ju",
title = "Execution of automatically parallelized {APL} programs
on {RP3}",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "767--777",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors have implemented an experimental APL/C
compiler, which accepts ordinary APL programs and
produces C programs. They have also implemented a
run-time environment that supports the parallel
execution of these C programs on the RP3 computer, a
shared-memory, 64-way MIMD machine built at the IBM
Thomas J. Watson Research Center. The APL/C compiler
uses the front end of the APL/370 compiler and imposes
the same restrictions, but requires no parallelization
directives from the user. The run-time environment is
based on simple synchronization primitives and is
implemented using Mach threads. They report the
speedups of several compiled programs running on RP3
under the Mach operating system. The current
implementation exploits only data parallelism. They
discuss the relationship between the style of an APL
program and its expected benefit from the automatic
parallel execution provided by the compiler.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other processors);
C6150N (Distributed systems); C6140D (High level
languages)",
classification = "C6140D (High level languages); C6150C (Compilers,
interpreters and other processors); C6150N (Distributed
systems)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "APL; APL/370 compiler; APL/C; APL/C compiler;
Automatically parallelized APL programs; automatically
parallelized APL programs; C language; C programs;
compiler; compilers; Data parallelism; data
parallelism; Mach operating; Mach operating system;
Mach threads; multiprocessing programs; program; RP3;
Shared-memory; shared-memory; synchronisation;
Synchronization primitives; synchronization primitives;
system",
thesaurus = "APL; C language; Multiprocessing programs; Program
compilers; Synchronisation",
treatment = "P Practical",
}
@Article{Sarkar:1991:APP,
author = "V. Sarkar",
title = "Automatic partitioning of a program dependence graph
into parallel tasks",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "779--804",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The author describes a general interprocedural
framework for partitioning a program dependence graph
into parallel tasks for execution on a multiprocessor
system. Partitioning techniques are necessary to
execute a parallel program at the appropriate
granularity for a given target multiprocessor. The
problem is to determine the best trade-off between
parallelism and overhead. It is desirable for the
partitioning to be performed automatically, so that the
programmer can write a parallel program without being
burdened by details of the overhead target
multiprocessor, and so that the same parallel program
can be made to execute efficiently on different
multiprocessors. For each procedure, the partitioning
algorithm attempts to minimize the estimated parallel
execution time. The estimated parallel execution time
reflects a trade-off between parallelism and overhead
and is minimized at an optimal intermediate granularity
of parallelism. Execution-profiling information is used
to obtain accurate execution-time estimates. The
partitioning framework has been completely implemented
in the PTRAN system at the IBM Thomas J. Watson
Research Center. Partitioned parallel programs
generated by this prototype system have been executed
on the IBM 3090 and RP3 multiprocessor systems.",
acknowledgement = ack-nhfb,
affiliation = "IBM Palo Alto Sci. Center, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems); C6110P (Parallel
programming)",
classification = "C6110P (Parallel programming); C6150N (Distributed
systems)",
corpsource = "IBM Palo Alto Sci. Center, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Execution profiling; execution profiling;
Execution-time estimates; execution-time estimates;
Granularity; granularity; IBM 3090; Interprocedural
framework; interprocedural framework; multiprocessing
programs; Multiprocessor system; multiprocessor system;
multiprocessor systems; Overhead; overhead; parallel;
Parallel execution time; parallel execution time;
Parallel program; parallel program; parallel
programming; Parallel tasks; Parallelism; parallelism;
Partitioning framework; partitioning framework; Program
dependence graph; program dependence graph; PTRAN
system; RP3; RP3 multiprocessor systems; tasks",
thesaurus = "Multiprocessing programs; Parallel programming",
treatment = "B Bibliography; P Practical",
}
@Article{Irvin:1991:MPC,
author = "D. R. Irvin",
title = "Monitoring the performance of commercial {T1}-rate
transmission service",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "805--814",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper gathers the scattered empirical and
theoretical elements of the performance-management
problem for commercial T1-rate transmission service and
integrates these elements in a useful way. The author
proposes two variants of a time-based
performance-monitoring algorithm that are insensitive
to the arrival pattern of transmission errors. The
first variant compares a count of errored seconds
accumulated over an interval of time to a fixed
threshold, and issues an alert to the network operator
indicating degraded transmission performance whenever
the count exceeds the threshold before the measurement
interval expires. The fixed-threshold test is
calibrated with reference to the well-known Neyman
model of transmission errors on metallic-conductor
systems. This calibration is then shown to be suitable
as well for monitoring the performance of fiber-optic
transmission systems where errored seconds follow the
cumulative binomial distribution. The second variant of
the new performance-monitoring algorithm replaces the
fixed-threshold test with a dual-threshold test having
a lower threshold that remains fixed and a higher
threshold that floats in response to changes in error
characteristics. An analysis based on the difference
equations that describe the movement of the floating
threshold shows that the dual-threshold test is more
responsive than the fixed-threshold test in detecting
nonstationary trends toward degraded transmission and
in detecting stable but mediocre performance levels.",
acknowledgement = ack-nhfb,
affiliation = "IBM Networking Syst., Emerging Carrier Technol.,
Research Triangle Park, NC, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210C (Network management)",
classification = "B6210C (Network management)",
corpsource = "IBM Networking Syst., Emerging Carrier Technol.,
Research Triangle Park, NC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Arrival pattern; arrival pattern; conductor systems;
data communication systems; degraded transmission;
Degraded transmission performance; Difference
equations; difference equations; digital communication
systems; Fiber-optic transmission systems; fiber-optic
transmission systems; Fixed-threshold test;
fixed-threshold test; Floating threshold; floating
threshold; management; metallic-; Metallic-conductor
systems; Neyman model; performance; performance
evaluation; performance-management;
Performance-management problem; problem; T1-rate
transmission service; telecommunication network;
telecommunication services; Time-based
performance-monitoring algorithm; time-based
performance-monitoring algorithm; Transmission errors;
transmission errors",
thesaurus = "Data communication systems; Digital communication
systems; Performance evaluation; Telecommunication
network management; Telecommunication services",
treatment = "P Practical",
}
@Article{Bozman:1991:TSC,
author = "G. P. Bozman and H. H. Ghannad and E. D. Weinberger",
title = "A trace-driven study of {CMS} file references",
journal = j-IBM-JRD,
volume = "35",
number = "5/6",
pages = "815--828",
month = sep # "\slash " # nov,
year = "1991",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper presents a detailed study of file reference
patterns by users of a VM/CMS interactive system. The
data were collected from two different IBM locations
via CMON, a CMS monitoring facility. The authors
present background information about the CMS file
system, the CMON program, and data-reduction programs,
as well as a discussion of the results. Some earlier
studies of this type have been restricted to a static
analysis of the existing files. However, as is shown, a
static analysis does not reliably reflect dynamic file
reference behavior. By using both static statistics and
dynamic statistics, it is possible to better understand
how file systems are used, to evaluate possible
changes, and to provide distribution parameters for
modeling. More recent studies of other interactive
systems have measured dynamic activity patterns. They
compare results with these when appropriate.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150J (Operating systems); C6120 (File
organisation)",
classification = "C6120 (File organisation); C6150J (Operating
systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(computers); CMON; CMS file references; CMS monitoring
facility; data reduction; Data-reduction programs;
data-reduction programs; distribution; Distribution
parameters; dynamic; Dynamic file reference behavior;
Dynamic statistics; dynamic statistics; file
organisation; file reference; file reference behavior;
File reference patterns; IBM locations; Interactive
systems; interactive systems; operating systems;
parameters; patterns; Trace-driven analysis;
trace-driven analysis; VM/CMS interactive system",
thesaurus = "Data reduction; File organisation; Operating systems
[computers]",
treatment = "P Practical",
}
@Article{McGroddy:1992:PPT,
author = "J. C. McGroddy",
title = "Preface: Papers on Thin-Film-Transistor Liquid-Crystal
Display Technology",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "2--2",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
}
@Article{Howard:1992:TFT,
author = "W. E. Howard",
title = "Thin-film-transistor\slash liquid crystal display
technology --- an introduction",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "3--10",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Liquid crystals are simple and very efficient
electro-optic transducers, or light valves. Thin-film
transistors are simple electronic control devices which
can be fabricated on large transparent substrates.
These two technologies, when combined, allow the
fabrication of electronic displays which challenge the
dominance of the cathode ray tube (CRT). This paper
reviews the history of this important development,
presents the current status in comparison to the color
CRT, and describes the remaining challenges to be
overcome if the color CRT is truly to be displaced.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4150D (Liquid
crystal devices); B2560R (Insulated gate field effect
transistors)",
classification = "B2560R (Insulated gate field effect transistors);
B4150D (Liquid crystal devices); B7260 (Display
technology and systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "challenges; Challenges; colour displays; Colour
displays; history; History; introduction; Introduction;
LCD; liquid crystal displays; reviews; Reviews; TFT;
TFT/LCD; thin film transistors",
thesaurus = "History; Liquid crystal displays; Thin film
transistors",
treatment = "G General Review",
}
@Article{Alt:1992:GAT,
author = "P. M. Alt and C. G. Powell and B. L. {Owens, Jr.} and
H. Ifill",
title = "A gray-scale addressing technique for
thin-film-transistor\slash liquid crystal displays",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "11--22",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An addressing technique allowing continuous-tone color
images to be rendered on thin-film-transistor/liquid
crystal displays having bilevel drivers is described.
The technique uses multiple subfields per frame, with
driver voltages changed synchronously with the field
data. By using N bits of data per pixel, excitation is
applied to the display one bit-plane per field for N
consecutive fields. The technique is analyzed, its
benefits and limitations discussed, and experimental
results presented. Up to 16 gray levels have been
demonstrated with good image quality.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4150D (Liquid
crystal devices); B2560R (Insulated gate field effect
transistors)",
classification = "B2560R (Insulated gate field effect transistors);
B4150D (Liquid crystal devices); B7260 (Display
technology and systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bilevel drivers; Bilevel drivers; colour displays;
Colour displays; continuous-tone color images;
Continuous-tone color images; experimental results;
Experimental results; gray-scale addressing; Gray-scale
addressing technique; image; Image quality; LCD; liquid
crystal displays; multiple subfields per frame;
Multiple subfields per frame; quality; technique; TFT;
TFT/LCD; thin film transistors",
thesaurus = "Liquid crystal displays; Thin film transistors",
treatment = "P Practical; X Experimental",
}
@Article{Takano:1992:CDG,
author = "H. Takano and S. Suzuki and H. Hatoh",
title = "Cell design of gray-scale thin-film-transistor-driven
liquid crystal displays",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "23--42",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The desirable liquid crystal (LC) panel cell design
for a gray-scale thin-film-transistor (TFT) -driven
twisted nematic (TN) liquid crystal display (LCD) is
discussed in terms of display legibility and ease of
fabrication. To optimize cell design for gray-scale
application, some key display factors such as contrast
ratio, color change, and viewing cone are evaluated for
various cell geometries and cell thicknesses. The cell
geometries discussed are combinations of two display
modes (a normally white mode and a normally black mode)
and two optical eigenmodes. A new driving scheme of
threshold-voltage bias application to the LC cell is
proposed to overcome the TN LCD shortcoming of a narrow
viewing cone. The authors have adopted a cell design
for a 512-color TFT LCD: (1) a first minimum normally
white (NW) mode as polarizer arrangement for ease of
fabrication, (2) an extraordinary-ray mode (e-mode) as
optical eigenmode with a novel driving scheme
(threshold-voltage biased) for gray-scale improvement
in eliminating brightness reversals, and (3) a
retardation (d Delta n) value of 0.47$\mu$m for further
optimization of proper gray-scale order and color
change.",
acknowledgement = ack-nhfb,
affiliation = "IBM Japan, Display Technol., Kanagawa, Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4150D (Liquid
crystal devices)",
classification = "B4150D (Liquid crystal devices); B7260 (Display
technology and systems)",
corpsource = "IBM Japan, Display Technol., Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arrangement; cell; cell design; Cell design; Cell
geometries; cell thicknesses; Cell thicknesses; color
change; Color change; color displays; Color displays;
color LCD; Color LCD; contrast ratio; Contrast ratio;
display; Display factors; display legibility; Display
legibility; display modes; Display modes; driving;
Driving scheme; ease of fabrication; Ease of
fabrication; extraordinary-ray mode; Extraordinary-ray
mode; factors; geometries; gray-scale application;
Gray-scale application; LCD; liquid crystal display;
Liquid crystal display; liquid crystal displays; mode;
normally black mode; Normally black mode; normally
white; Normally white mode; optical eigenmodes; Optical
eigenmodes; polarizer; Polarizer arrangement; scheme;
TFT; TFT LCD; thin film transistors; threshold-voltage
bias; Threshold-voltage bias; twisted nematic; Twisted
nematic; viewing angle; Viewing angle; viewing cone;
Viewing cone",
thesaurus = "Liquid crystal displays; Thin film transistors",
treatment = "N New Development; P Practical; X Experimental",
}
@Article{Koseki:1992:CFT,
author = "T. Koseki and T. Fukunaga and H. Yamanaka and T.
Ueki",
title = "Color filter for 10.4-in.-diagonal 4096-color
thin-film-transistor liquid crystal displays",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "43--50",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Color filters with a wide color reproduction gamut and
high transmittance were developed for 10.4-in.-diagonal
4096-color thin-film-transistor liquid crystal displays
using pigment-dispersed photosensitive polymers. The
transmission spectrum of each color pixel was designed
in conjunction with other components such as backlight
and polarizers in order to meet front-of-screen quality
requirements. To improve screen quality, a
low-resistivity common electrode was used, eliminating
the top coating. A repair technique utilizing
back-exposure was also developed to improve production
yield. This pigment-dispersed-type color filter has the
merits of a simple process, low fabrication cost, good
uniformity, high reliability, and applicability to
high-resolution displays. There is a problem involving
deterioration of contrast ratio caused by the
depolarization effect of the color filter. The authors
measured depolarization factors for several pigments
and showed that the yellow pigment was the major
contributor. This depolarization effect has been
minimized.",
acknowledgement = ack-nhfb,
affiliation = "IBM Japan, Display Techol., Kanagawa, Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4190F
(Optical coatings and filters); B4150D (Liquid crystal
devices)",
classification = "B4150D (Liquid crystal devices); B4190F (Optical
coatings and filters); B7260 (Display technology and
systems)",
corpsource = "IBM Japan, Display Techol., Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "10.4 in; 10.4 In; backlight; Backlight; color filter;
color filters; Color filters; contrast; Contrast ratio;
depolarization effect; Depolarization effect;
front-of-screen quality; Front-of-screen quality; high
transmittance; High transmittance; high-resolution
displays; High-resolution displays; liquid crystal
displays; low fabrication cost; Low fabrication cost;
optical filters; pigment-dispersed photosensitive
polymers; Pigment-dispersed photosensitive polymers;
pigment-dispersed-type; Pigment-dispersed-type color
filter; polarizers; Polarizers; production yield;
Production yield; ratio; reliability; Reliability;
repair technique; Repair technique; simple process;
Simple process; spectrum; thin film; transistors;
transmission; Transmission spectrum; uniformity;
Uniformity; wide color reproduction; Wide color
reproduction",
numericalindex = "Size 2.64E-01 m",
thesaurus = "Liquid crystal displays; Optical filters; Thin film
transistors",
treatment = "P Practical; X Experimental",
}
@Article{Lien:1992:LFE,
author = "A. Lien and R. A. John",
title = "Lateral field effect in twisted nematic cells",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "51--58",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The lateral field existing in the ON state of a liquid
crystal display (LCD) can result in an undesired
reverse tilt domain in each pixel, thereby leading to
poor contrast ratio of the display. As pixel size
becomes smaller to meet the requirements of a
high-information-content display, the problem becomes
worse. In this paper, the authors present experimental
results and theoretical analysis of the lateral field
effect in the twisted nematic (TN) cell, which is most
commonly used in the thin-film-transistor liquid
crystal displays (TFT/LCD). The effects of various cell
parameters, such as pretilt angle, bus-line-to-pixel
spacing, and cell gap thickness, on the pixel reverse
tilt domain and on the corresponding optical
performance have been studied in detail. The results
are useful for TFT/LCD design and cell fabrication.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4150D (Liquid
crystal devices)",
classification = "B4150D (Liquid crystal devices); B7260 (Display
technology and systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; angle; Bus-line-to-pixel spacing;
bus-line-to-pixel spacing; cell; Cell fabrication; cell
gap thickness; Cell gap thickness; Cell parameters;
cell parameters; contrast; Contrast ratio; Experimental
results; experimental results; fabrication; Lateral
field effect; lateral field effect; Liquid crystal
display; liquid crystal display; liquid crystal
displays; Optical performance; optical performance;
pixel; Pixel reverse tilt domain; pixel size; Pixel
size; pretilt; Pretilt angle; ratio; reverse tilt
domain; TFT/LCD; theoretical; Theoretical analysis;
thin film transistors; twisted nematic cells; Twisted
nematic cells",
thesaurus = "Liquid crystal displays; Thin film transistors",
treatment = "P Practical; X Experimental",
}
@Article{Jenkins:1992:FTT,
author = "L. C. Jenkins and R. J. Polastre and R. R. Troutman
and R. L. Wisnieff",
title = "Functional testing of {TFT\slash LCD} arrays",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "59--68",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The thin-film-transistor liquid crystal display
(TFT/LCD) is emerging as the leading flat-panel display
in computer applications. TFT array characterization is
important to the research, development, and
manufacturing of TFT/LCDs. The authors describe a new
Dynamic Array Tester developed for that purpose and
describes some examples of its use.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7260 (Display technology and systems); B4150D (Liquid
crystal devices); B0170E (Production facilities and
engineering); B0170L (Inspection and quality control);
B7210B (Automatic test and measurement systems); B2560R
(Insulated gate field effect transistors); C7410H
(Instrumentation)",
classification = "B0170E (Production facilities and engineering);
B0170L (Inspection and quality control); B2560R
(Insulated gate field effect transistors); B4150D
(Liquid crystal devices); B7210B (Automatic test and
measurement systems); B7260 (Display technology and
systems); C7410H (Instrumentation)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic test equipment; color displays; Color
displays; display; displays; Dynamic Array Tester;
electron device testing; flat-panel; Flat-panel
display; functional testing; Functional testing; IBM;
inspection; integrated circuit testing; liquid crystal;
TFT array characterization; TFT/LCD; thin film
transistors; thin-film-; Thin-film-transistor liquid
crystal display; transistor liquid crystal display",
thesaurus = "Automatic test equipment; Electron device testing;
Inspection; Integrated circuit testing; Liquid crystal
displays; Thin film transistors",
treatment = "P Practical; R Product Review; X Experimental",
}
@Article{Kuo:1992:RIE,
author = "Y. Kuo",
title = "Reactive ion etching technology in
thin-film-transistor processing",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "69--75",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Discusses reactive ion etching (RIE) process issues in
preparing thin-film transistors (TFTs) for liquid
crystal displays (LCDs). Three areas were examined in
detail: gate metal etch, dielectric etch, and a-Si:H
etch, both intrinsic and n/sup +/ doped. Although there
are different requirements for each step, the basic
principles for the etching process are similar. For
example, each process includes three major mechanisms:
plasma-phase chemistry, particle transport phenomena,
and surface reactions. All data on the etching results
were interpreted according to these principles.
Finally, a TFT characteristic curve based on RIE of
some of the most critical process steps is presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si:H/bin Si/bin H/bin Si/el H/el H/dop",
classcodes = "B4150D (Liquid crystal devices); B7260 (Display
technology and systems); B2560R (Insulated gate field
effect transistors); B2550E (Surface treatment)",
classification = "B2550E (Surface treatment); B2560R (Insulated gate
field effect transistors); B4150D (Liquid crystal
devices); B7260 (Display technology and systems)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "a-Si:H etch; A-Si:H etch; amorphous Si:H; Amorphous
Si:H etch; characteristic curve; critical process
steps; Critical process steps; dielectric; Dielectric
etch; etch; etching process; Etching process; gate
metal etch; Gate metal etch; LCDs; liquid crystal
displays; Liquid crystal displays; particle transport
phenomena; Particle transport phenomena; plasma-phase
chemistry; Plasma-phase chemistry; reactive ion
etching; Reactive ion etching; sputter etching; surface
reactions; Surface reactions; TFT; TFT characteristic
curve; TFTs; thin film; thin-film-transistor
processing; Thin-film-transistor processing;
transistors",
thesaurus = "Liquid crystal displays; Sputter etching; Thin film
transistors",
treatment = "X Experimental",
}
@Article{Fujimoto:1992:SVS,
author = "Y. Fujimoto",
title = "Study of the {V}$_{\rm th}$ shift of the thin-film
transistor by the bias temperature stress test",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "76--82",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Amorphous silicon thin-film transistors (a-Si:H TFTs)
are now widely used as the switching device in the
active-matrix addressing of liquid crystal displays.
One concern is the potential instability problems
associated with the threshold voltage (V$_{th}$) shifts
to higher values after prolonged operating times. The
reason for this V$_{th}$ shift has been widely
discussed, and two models accounting for it have been
suggested. One model explains the shifts by the
trapping of electrons in the insulator, the other model
by the creation of the metastable states at the
a-Si:H/SiN$_x$ interface. The author's TFT insulator
has the rather complicated structure of an anodic oxide
film, SiO$_x$, SiN$_x$ sequentially stacked over the
gate electrode, which makes it difficult to separate
the contribution of each layer. To confirm the V$_{th}$
shift mechanism and the contribution of each layer of
insulator to the V$_{th}$ shift, he prepared samples
with a series of different insulators and measured the
bias dependence of their V$_{th}$ shifts. His results
show that the anodic oxide film makes no contribution
to the V$_{th}$ shift, and it makes little difference
to the V$_{th}$ shift whether the next insulator is
SiN$_x$ or SiO$_x$.",
acknowledgement = ack-nhfb,
affiliation = "IBM Japan, Display Technol., Kanagawa, Japan",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "SiN/int SiO/int Si/int N/int O/int SiN/bin SiO/bin
Si/bin N/bin O/bin; Si:H/int Si/int H/int Si:H/bin
Si/bin H/bin Si/el H/el H/dop; Si:H-SiN/int Si:H/int
SiN/int Si/int H/int N/int Si:H/bin SiN/bin Si/bin
H/bin N/bin Si/el H/el H/dop",
classcodes = "B2560R (Insulated gate field effect transistors);
B7260 (Display technology and systems); B4150D (Liquid
crystal devices); B2560B (Modelling and equivalent
circuits); B0170E (Production facilities and
engineering); B2520F (Amorphous and glassy
semiconductors); B0550 (Composite materials); B2830E
(Inorganic insulation)",
classification = "B0170E (Production facilities and engineering);
B0550 (Composite materials); B2520F (Amorphous and
glassy semiconductors); B2560B (Modelling and
equivalent circuits); B2560R (Insulated gate field
effect transistors); B2830E (Inorganic insulation);
B4150D (Liquid crystal devices); B7260 (Display
technology and systems)",
corpsource = "IBM Japan, Display Technol., Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "active-matrix; Active-matrix addressing; addressing;
amorphous semiconductors; Amorphous Si:H transistors;
amorphous Si:H transistors; Anodic oxide film; anodic
oxide film; Bias temperature stress test; bias
temperature stress test; composite insulating
materials; dielectric thin films; electrons; elemental
semiconductors; environmental testing; hydrogen; Liquid
crystal displays; liquid crystal displays; Metastable
states; metastable states; Models; models;
semiconductor device models; Semiconductors;
semiconductors; Si:H-SiN$_x$; silicon; silicon
compounds; TFT; thin film transistors; thin-film;
Thin-film transistor; Threshold voltage shift;
threshold voltage shift; transistor; trapping of;
Trapping of electrons",
thesaurus = "Amorphous semiconductors; Composite insulating
materials; Dielectric thin films; Elemental
semiconductors; Environmental testing; Hydrogen; Liquid
crystal displays; Semiconductor device models; Silicon;
Silicon compounds; Thin film transistors",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Wong:1992:TCD,
author = "H.-S. Wong and Y. L. Yao and E. S. Schlig",
title = "{TDI} charge-coupled devices; design and
applications",
journal = j-IBM-JRD,
volume = "36",
number = "1",
pages = "83--106",
month = jan,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The design and applications of charge-coupled devices
(CCDs) operated in the time-delay-and-integration (TDI)
mode are reviewed. Design issues regarding the use of
the TDI-CCD imager for visible imaging applications are
discussed. Aspects pertaining to its parallel array,
serial-to-parallel interface, serial register,
modulation transfer function (MTF), discrete charge
motion, motion synchronization, clocking, number of
integrating stages, noise, dynamic range, sensitivity,
output uniformity, device yield, pixel size, and
spectral response are highlighted in the context of
their effect on system performance. Its imaging
characteristics are compared to those of the photodiode
linear array imager, and design studies and
experimental results for a family of TDI-CCD imagers
for scanning documents and museum art objects are
described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0762 (Detection of radiation (bolometers,
photoelectric cells, i.r. and submillimetre waves
detection)); A4230L (Modulation and optical transfer
functions); B7230G (Image sensors); B2570H (Other field
effect integrated circuits)",
classification = "A0762 (Detection of radiation (bolometers,
photoelectric cells, i.r. and submillimetre waves
detection)); A4230L (Modulation and optical transfer
functions); B2570H (Other field effect integrated
circuits); B7230G (Image sensors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; Applications; CCD image sensors;
charge-coupled devices; Charge-coupled devices;
clocking; Clocking; design issues; Design issues;
design studies; Design studies; device; Device yield;
discrete charge motion; Discrete charge motion; dynamic
range; Dynamic range; experimental results;
Experimental results; function; imaging
characteristics; Imaging characteristics; modulation
transfer; Modulation transfer function; motion; Motion
synchronization; MTF; museum art objects; noise; Noise;
number of integrating stages; Number of integrating
stages; optical transfer function; output uniformity;
Output uniformity; parallel array; Parallel array;
parallel interface; photodiode linear array imager;
Photodiode linear array imager; pixel size; Pixel size;
scanning; scanning documents; Scanning documents;
Scanning museum art objects; sensitivity; Sensitivity;
serial register; Serial register; serial-to-;
Serial-to-parallel interface; spectral response;
Spectral response; synchronization; system performance;
System performance; TDI-CCD imager;
time-delay-and-integration mode;
Time-delay-and-integration mode; visible imaging;
Visible imaging; yield",
thesaurus = "CCD image sensors; Optical transfer function",
treatment = "B Bibliography; T Theoretical or Mathematical; X
Experimental",
}
@Article{Lipari:1992:PMS,
author = "N. O. Lipari",
title = "Preface: Materials Science for Silicon Technology",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "138--139",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
}
@Article{Oehrlein:1992:PDE,
author = "G. S. Oehrlein and J. F. Rembetski",
title = "Plasma-based dry etching techniques in the silicon
integrated circuit technology",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "140--157",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Plasma-based dry etching techniques play a major role
in the formation of silicon-based integrated circuits.
The first part of this paper reviews understanding of
the means for achieving etching directionality and
selectivity in reactive etching using glow discharges.
Relevant trends in magnetically enhanced RF diode
systems, microwave-excited electron cyclotron resonance
plasmas, process clustering, real-time process
monitoring and control, and computer modeling of glow
discharges are discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B2550E (Surface treatment); B2570 (Semiconductor
integrated circuits)",
classification = "B2550E (Surface treatment); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit technology; clustering; computer modeling;
Computer modeling; dry; Dry etching techniques;
elemental semiconductors; etching; etching
directionality; Etching directionality; etching
selectivity; Etching selectivity; etching techniques;
excited electron cyclotron resonance plasmas; glow
discharges; Glow discharges; integrated; integrated
circuit technology; Integrated circuit technology;
microwave-; Microwave-excited electron cyclotron
resonance plasmas; process; Process clustering;
reactive; Reactive etching; real-time process
monitoring; Real-time process monitoring; RF diode
systems; semiconductor process modelling; Si; silicon;
sputter etching",
thesaurus = "Elemental semiconductors; Glow discharges; Integrated
circuit technology; Semiconductor process modelling;
Silicon; Sputter etching",
treatment = "A Application; P Practical",
}
@Article{Fahey:1992:SDS,
author = "P. M. Fahey and S. R. Mader and S. R. Stiffler and R.
L. Mohler and J. D. Mis and J. A. Slinkman",
title = "Stress-induced dislocations in silicon integrated
circuits",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "158--182",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Many of the processes used in the fabrication of
silicon integrated circuits lead to the development of
stress in the silicon substrate. Given enough stress,
the substrate will yield by generating dislocations.
The authors examine the formation of stress-induced
dislocations in integrated circuit structures. Examples
are presented from bipolar and MOS-based integrated
circuit structures that were created during
developmental studies. The underlying causes of
oxidation-induced stress and the effect on such stress
of varying oxidation conditions are discussed. The
knowledge thus gained is used to explain dislocation
generation during the formation of a shallow-trench
isolation structure. The importance of ion-implantation
processes in nucleating dislocations is illustrated
using structures formed by a deep-trench isolation
process and a process used to form a trench capacitor
in a DRAM cell.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B2550E (Surface treatment); B2570F (Other MOS
integrated circuits); B2570B (Bipolar integrated
circuits); B1265D (Memory circuits)",
classification = "B1265D (Memory circuits); B2550E (Surface
treatment); B2570B (Bipolar integrated circuits);
B2570F (Other MOS integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar IC; Bipolar IC; bipolar integrated circuits;
capacitor; circuits; dislocation generation;
Dislocation generation; dislocations; DRAM cell; DRAM
chips; elemental semiconductors; Elemental
semiconductors; induced stress; integrated circuit
structures; Integrated circuit structures; integrated
circuit technology; internal stresses; ion
implantation; ion-implantation processes;
Ion-implantation processes; isolation structure; MOS
IC; MOS integrated; oxidation; oxidation-;
Oxidation-induced stress; shallow-trench;
Shallow-trench isolation structure; Si; silicon;
stress-induced; Stress-induced dislocations; trench;
Trench capacitor",
thesaurus = "Bipolar integrated circuits; Dislocations; DRAM chips;
Elemental semiconductors; Integrated circuit
technology; Internal stresses; Ion implantation; MOS
integrated circuits; Oxidation; Silicon",
treatment = "P Practical; X Experimental",
}
@Article{Kuan:1992:AEI,
author = "T. S. Kuan and P. E. Batson and R. M. Feenstra and A.
J. Slavin and R. M. Tromp",
title = "Application of electron and ion beam analysis
techniques to microelectronics",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "183--207",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The application of electron microscopy, scanning
tunneling microscopy, and medium-energy ion scattering
to microelectronics is reviewed. These analysis
techniques are playing an important role in advancing
the technology. Their use in the study of relevant
phenomena regarding surfaces, interfaces, and defects
is discussed. Recent developments and applications are
illustrated using results obtained at the IBM Thomas J.
Watson Research Center. Potential advances in the
techniques are also discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B2390
(Electron and ion microscopes)",
classification = "B2390 (Electron and ion microscopes); B2570
(Semiconductor integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; defects; Defects; electron microscopy;
Electron microscopy; integrated circuit testing;
interfaces; Interfaces; ion beam; ion beam analysis;
Ion beam analysis; medium-energy ion scattering;
Medium-energy ion scattering; microelectronics;
Microelectronics; monolithic integrated circuits;
scanning; scanning tunneling microscopy; Scanning
tunneling microscopy; surfaces; Surfaces; tunnelling
microscopy",
thesaurus = "Electron microscopy; Integrated circuit testing; Ion
beam applications; Monolithic integrated circuits;
Scanning tunnelling microscopy",
treatment = "A Application; P Practical",
}
@Article{Lee:1992:NMA,
author = "W. Lee and S. E. Laux and M. V. Fischetti and G.
Baccarani and A. Gnudi and J. M. C. Stork and J. A.
Mandelman and E. F. Crabbe and M. R. Wordeman and F.
Odeh",
title = "Numerical modeling of advanced semiconductor devices",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "208--232",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Numerical modeling of the electrical behavior of
semiconductor devices is playing an increasingly
important role in their development. Examples that
pertain to advanced MOSFETs and bipolar transistors are
presented to illustrate the importance of taking into
account three-dimensional as well as nonequilibrium and
nonlocal physical phenomena to effectively characterize
the electrical behavior of such devices.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2560B (Modelling and equivalent circuits); B2560R
(Insulated gate field effect transistors); B2560J
(Bipolar transistors)",
classification = "B2560B (Modelling and equivalent circuits); B2560J
(Bipolar transistors); B2560R (Insulated gate field
effect transistors)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D phenomena; bipolar; bipolar transistors; Bipolar
transistors; electrical behavior; Electrical behavior;
insulated gate field effect; MOSFETs; nonequilibrium
phenomena; Nonequilibrium phenomena; nonlocal physical
phenomena; Nonlocal physical phenomena; numerical
modelling; Numerical modelling; semiconductor device
models; semiconductor devices; Semiconductor devices;
transistors",
thesaurus = "Bipolar transistors; Insulated gate field effect
transistors; Semiconductor device models",
treatment = "T Theoretical or Mathematical",
}
@Article{Rubloff:1992:IPM,
author = "G. W. Rubloff and D. T. Bordonaro",
title = "Integrated processing for microelectronics science and
technology",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "233--276",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Reviews of integrated processing-an approach to
microelectronics fabrication in which sequential
processes are linked by wafer transfer through a clean,
controlled environment (e.g. high vacuum or inert gas).
The approach is rapidly becoming the state of the art
in microelectronics research, development, and
manufacturing. In microelectronics research, it
provides a means for advancing mechanistic
understanding and material quality through in situ
fabrication of test structures and extensive in situ
diagnostics. In microelectronics development and
manufacturing, it promises process simplification,
improved contamination control and yield, and
potentially more flexible equipment utilization. With
increasing emphasis on ultraclean processing, involving
control of reactive impurities as well as particles,
and on real-time process monitoring and control,
applications of integrated processing are moving toward
a common ground in which state-of-the-art research
techniques can be used to address key issues in
development and manufacturing, and provide in return
substantive guidelines for manufacturing design and
practice.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550 (Semiconductor device technology); B0170E
(Production facilities and engineering); B0170E
(Production facilities and engineering)",
classification = "B0170E (Production facilities and engineering);
B2550 (Semiconductor device technology)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "clean rooms; contamination control; Contamination
control; controlled; Controlled environment;
environment; in; In situ diagnostics; integrated
processing; Integrated processing; microelectronics
development; Microelectronics development;
microelectronics fabrication; Microelectronics
fabrication; microelectronics research;
Microelectronics research; production testing; quality
control; reactive impurities; Reactive impurities;
real-time process monitoring; Real-time process
monitoring; semiconductor device testing; semiconductor
technology; sequential processes; Sequential processes;
situ diagnostics; test structures; Test structures;
ultraclean processing; Ultraclean processing; wafer
transfer; Wafer transfer; yield; Yield",
thesaurus = "Clean rooms; Production testing; Quality control;
Semiconductor device testing; Semiconductor
technology",
treatment = "G General Review; P Practical",
}
@Article{Anonymous:1992:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "277--319",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:12:47 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1992:RIPb,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "36",
number = "2",
pages = "321--325",
month = mar,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:12:47 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Griesmer:1992:PPA,
author = "J. H. Griesmer",
title = "Preface: Papers on Artificial Intelligence",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "328--328",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wiederhold:1992:ASP,
author = "Gio Wiederhold and John McCarthy",
title = "{Arthur Samuel}: Pioneer in Machine Learning",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "329--331",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:07:49 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Antonacci:1992:CDM,
author = "F. Antonacci and C. M. Calamani",
title = "Capturing the deep meaning of texts through deduction
and inference",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "333--345",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "One of the main problems in the computer analysis of
natural language is understanding sentences beyond a
surface level, i.e. making inferences about likely
circumstances and drawing plausible conclusions. At the
first level, a natural-language-understanding system
can answer simple and trivial questions; in order to
extend the domain of possible questions that it can
answer, the system must make presuppositions and
recognize implications that depend on certain events
(also called actions). The IBM Rome Scientific Center
has developed a prototype system that is able to make
inferences about what might be true. This system has
been integrated with a text-understanding system
(System N), also developed at Rome.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rome, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6180N (Natural language processing); C6170 (Expert
systems)",
classification = "C6170 (Expert systems); C6180N (Natural language
processing)",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "actions; Actions; computer analysis; Computer
analysis; deduction; Deduction; implications
recognition; Implications recognition; inference
mechanisms; inferences; Inferences; likely
circumstances; Likely circumstances; natural languages;
natural-language-understanding;
Natural-language-understanding system; plausible
conclusions; Plausible conclusions; presuppositions;
Presuppositions; sentence understanding; Sentence
understanding; system; System N; text-understanding
system; Text-understanding system",
thesaurus = "Inference mechanisms; Natural languages",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Casanova:1992:ESR,
author = "M. A. Casanova and A. S. Hemerly and R. A. de T.
Guerreiro",
title = "Explaining {SLDNF} resolution with non-normal
defaults",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "347--359",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68N17 (68Q55)",
MRnumber = "93i:68037",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper defines a default logic interpretation for
normal programs that has the following major
characteristics. First, it directly captures the true
nature of SLDNF resolution as an extension of SLD
resolution. Second, it is semantically convincing, but
it requires neither an elaborated nonstandard
interpretation nor a radical rewriting of the program
clauses that would make it difficult to understand
their meaning. Last, it extends known results for
stratified normal programs to programs that satisfy a
weaker condition.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rio de Janeiro, Brazil",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6110L
(Logic programming); C4210 (Formal logic); C1230
(Artificial intelligence)",
classification = "C1230 (Artificial intelligence); C4210 (Formal
logic); C4240 (Programming and algorithm theory);
C6110L (Logic programming)",
corpsource = "IBM, Rio de Janeiro, Brazil",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "default logic interpretation; Default logic
interpretation; explanation; formal logic; logic
programming; normal programs; Normal programs; program
clauses; Program clauses; programming; resolution; SLD
resolution; SLDNF; SLDNF resolution; theory",
thesaurus = "Explanation; Formal logic; Logic programming;
Programming theory",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Guerreiro:1992:SPL,
author = "R. A. de T. Guerreiro and A. S. Hemerly and M. A.
Casanova",
title = "{STORK} and {PENGUIN}: logic programming systems using
general clauses and defaults",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "361--374",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68N17",
MRnumber = "1 193 365",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes two logic programming systems with
the expressive power of full clausal first-order logic
and with a nonmonotonic component. They provide a
direct generalization of pure Prolog and can be
implemented using the same technology as Prolog
processors. The inference engine of both systems is
based on the weak-model elimination method which, in
the case of the second system, is extended to
incorporate defaults.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rio de Janeiro, Brazil",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C1230
(Artificial intelligence); C6110L (Logic programming);
C6140D (High level languages)",
classification = "C1230 (Artificial intelligence); C4240 (Programming
and algorithm theory); C6110L (Logic programming);
C6140D (High level languages)",
corpsource = "IBM, Rio de Janeiro, Brazil",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "clausal first-; Clausal first-order logic; inference
engine; Inference engine; logic programming; logic
programming systems; Logic programming systems;
nonmonotonic component; Nonmonotonic component;
nonmonotonic reasoning; order logic; PENGUIN;
processors; programming; Prolog; PROLOG; Prolog
processors; pure Prolog; Pure Prolog; STORK; theory;
weak-model elimination method; Weak-model elimination
method",
thesaurus = "Logic programming; Nonmonotonic reasoning; Programming
theory; PROLOG",
treatment = "T Theoretical or Mathematical",
}
@Article{Beierle:1992:LPT,
author = "C. Beierle",
title = "Logic programming with typed unification and its
realization on an abstract machine",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "375--390",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
MRclass = "68N17 (68Q55)",
MRnumber = "1 193 366",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Logic programming can benefit from a typing concept
which supports many software engineering principles
such as data abstraction, modularization, etc. From a
computational point of view, the use of types can
drastically reduce the search space. Starting from
these observations, the paper gives a survey of
many-sorted, order-sorted, and polymorphic approaches
to type concepts in logic programming. The underlying
unification procedures for ordinary term unification,
order-sorted unification, and in particular for
polymorphic order-sorted unification are given in the
style of solving a set of equations, giving a common
basis for comparing them. In addition, the realization
of these unification procedures on a Warren abstract
machine-like architecture is described. Special
emphasis is placed on the abstract machine developed
for PROTOS-L, a logic programming language based on
polymorphic order-sorted unification.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Heidelberg, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6110L
(Logic programming); C6140D (High level languages);
C1230 (Artificial intelligence)",
classification = "C1230 (Artificial intelligence); C4240 (Programming
and algorithm theory); C6110L (Logic programming);
C6140D (High level languages)",
corpsource = "IBM, Heidelberg, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "data abstraction; Data abstraction; engineering;
logic; logic programming; Logic programming; logic
programming language; Logic programming language; logic
programming languages; modularization; Modularization;
order-sorted; Order-sorted unification; ordinary term
unification; Ordinary term unification; polymorphic
order-sorted unification; Polymorphic order-sorted
unification; programming; PROTOS-L; software; Software
engineering; type theory; typed unification; Typed
unification; unification; Warren abstract machine",
thesaurus = "Logic programming; Logic programming languages; Type
theory",
treatment = "T Theoretical or Mathematical",
}
@Article{Asakawa:1992:ZTT,
author = "Y. Asakawa and H. Komatsu and H. Etoh and Y. Hama and
K. Maruyama",
title = "{Zephyr}: Toward true compiler-based programming in
{Prolog}",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "391--408",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Prolog is widely used in prototyping, especially in
artificial intelligence, but it has yet to gain
widespread acceptance in application development. The
authors think that the problems in this area result
from the programming style enforced in existing Prolog
systems. Zephyr is a new Prolog system refined and
enhanced to help solve such problems. It allows users
to do modular programming by always using a compiler
instead of an interpreter. The authors describe the
unique features of Zephyr which make this possible,
focusing especially on package, metafunctions, and
tables, and the implementation of the system on OS/2.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Kanagawa, Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6140D (High level languages); C6110L (Logic
programming); C6150C (Compilers, interpreters and other
processors)",
classification = "C6110L (Logic programming); C6140D (High level
languages); C6150C (Compilers, interpreters and other
processors)",
corpsource = "IBM, Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "artificial; Artificial intelligence; compiler-based
programming; Compiler-based programming; compilers;
intelligence; logic programming; logic programming
languages; metafunctions; Metafunctions; modular
programming; Modular programming; OS/2; package;
Package; program; programming style; Programming style;
PROLOG; Prolog system; prototyping; Prototyping;
tables; Tables; Zephyr",
thesaurus = "Logic programming; Logic programming languages;
Program compilers; PROLOG",
treatment = "P Practical",
}
@Article{Apte:1992:ECO,
author = "C. V. Apte and R. A. Dionne and J. H. Griesmer and M.
Karnaugh and J. K. Kastner and M. M. Laker and E. K.
Mays",
title = "An experiment in constructing an open expert system
using a knowledge substrate",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "409--434",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Discusses an experiment in the use of an
object-centered knowledge representation service to
provide a common conceptual model for the construction
of a large knowledge-intensive decision support tool. A
core knowledge substrate forms a common resource for a
variety of problem-solving activities and a basis for
the rapid construction of new capabilities. FAME, a
substantial expert system to aid in the financial
marketing of IBM mainframes, has been built and
extensively tested in the field to validate these tools
and techniques.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7120 (Finance); C7170 (Marketing); C6170 (Expert
systems); C7102 (Decision support systems)",
classification = "C6170 (Expert systems); C7102 (Decision support
systems); C7120 (Finance); C7170 (Marketing)",
corpsource = "IBM, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "common conceptual model; Common conceptual model;
common resource; Common resource; decision support
systems; expert systems; FAME; financial data;
financial marketing; Financial marketing; IBM
mainframes; knowledge representation; knowledge
representation service; knowledge substrate; Knowledge
substrate; knowledge-intensive decision support tool;
Knowledge-intensive decision support tool; marketing
data; object-centered; Object-centered knowledge
representation service; open expert system; Open expert
system; problem solving; problem-solving;
Problem-solving; processing",
thesaurus = "Decision support systems; Expert systems; Financial
data processing; Knowledge representation; Marketing
data processing; Problem solving",
treatment = "P Practical; X Experimental",
}
@Article{Wetter:1992:UNL,
author = "T. Wetter and R. Nuse",
title = "Use of natural language for knowledge acquisition:
Strategies to cope with semantic and pragmatic
variation",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "435--468",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The large amount of verbal data from common
knowledge-elicitation methods suggests using the data
directly for knowledge acquisition by means of
sophisticated natural-language analyzers (NLAs). The
paper analyzes the feasibility of such an approach
theoretically and presents a number of examples. In the
theoretical part of the text it first provides a
detailed analysis of the entities involved, i.e. the
domains of expertise, the qualities of knowledge about
domains, the properties of generic sentences and texts
in natural languages, and the conclusions to be drawn
from the limited expressiveness of formal
representations. Then it discusses the processes of
transforming knowledge into natural language and of
transforming natural language into formal language.
Since much can go wrong in both processes, the paper
derives desired relations or validity criteria among
the entities and strategies to meet the criteria. It is
believed that this broad theoretical framework can be
used to analyze and compare existing attempts at
directly using natural language for knowledge
acquisition, and thus assess the present status of the
field.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Heidelberg, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6170 (Expert systems); C6180N (Natural language
processing)",
classification = "C6170 (Expert systems); C6180N (Natural language
processing)",
corpsource = "IBM, Heidelberg, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "entities; Entities; formal; Formal language; knowledge
acquisition; Knowledge acquisition;
knowledge-elicitation; Knowledge-elicitation methods;
language; methods; natural languages; natural-language
analyzers; Natural-language analyzers; strategies;
Strategies; validity criteria; Validity criteria;
verbal data; Verbal data",
thesaurus = "Knowledge acquisition; Natural languages",
treatment = "B Bibliography; P Practical",
}
@Article{Nguyen:1992:TRA,
author = "T. N. Nguyen and H. E. Stephanou",
title = "Topological reasoning about dextrous grasps",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "469--486",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper introduces a reasoning scheme called
topological reasoning that is used in conjunction with
a grasp-based, topological model for uniform
representations of multifingered robot hands at
different levels of detail (e.g. whole hand, finger,
joint), and discusses its application to dextrous
manipulation (grasp selection and regrasping). It is
shown that using topological reasoning, both hand
posture and hand functionality can be derived from
symbolic, high-level task requirements and object
attributes, and can be transformed into numeric,
low-level, joint space variables. Furthermore, the
reasoning scheme is applicable not only to tip
prehension, but also to palm prehension and any
combination of the two.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Gaithersburg, MD, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C3390 (Robotics); C6170 (Expert systems); C1230
(Artificial intelligence)",
classification = "C1230 (Artificial intelligence); C3390 (Robotics);
C6170 (Expert systems)",
corpsource = "IBM, Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Dextrous grasps; dextrous grasps; Dextrous
manipulation; dextrous manipulation; grasp; Grasp
selection; Hand functionality; hand functionality; hand
posture; Hand posture; inference mechanisms;
manipulators; Multifingered robot hands; multifingered
robot hands; Palm prehension; palm prehension;
prehension; Regrasping; regrasping; selection; tip; Tip
prehension; Topological model; topological model;
topological reasoning; Topological reasoning",
thesaurus = "Inference mechanisms; Manipulators",
treatment = "B Bibliography; P Practical",
}
@Article{DiZenzo:1992:ORH,
author = "S. {Di Zenzo}o and M. {Del Buono} and M. Meucci and A.
Spirito",
title = "Optical recognition of hand-printed characters of any
size, position, and orientation",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "487--501",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Deals with the optical recognition of text data in
documents such as engineering drawings, land-use and
land-register maps, and utility maps. The automatic
computer acquisition of these documents is performed
through the basic steps of vectorization of the
line-structure and recognition of the text data
interspersed in the document. The latter data are
usually handwritten by professional draftsmen, and may
have any size, position, and orientation. The paper
reviews some of the features appropriate to this
particular OCR problem, and suggests a special
recognition strategy. Numerous examples are given. The
results obtained with a prototype system on actual
land-register maps are reported.",
acknowledgement = ack-nhfb,
affiliation = "IBM, Rome, Italy",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5260B (Computer vision and picture processing)",
classification = "C5260B (Computer vision and picture processing)",
corpsource = "IBM, Rome, Italy",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automatic computer acquisition; Automatic computer
acquisition; engineering drawings; Engineering
drawings; hand-printed characters; Hand-printed
characters; handwritten data; Handwritten data; land
use maps; Land use maps; land-; Land-register maps;
line structure vectorization; Line structure
vectorization; OCR; optical character recognition;
optical recognition; Optical recognition; professional
draftsmen; Professional draftsmen; recognition;
register maps; text data; Text data; Text data
recognition; utility maps; Utility maps",
thesaurus = "Optical character recognition",
treatment = "P Practical",
}
@Article{Anonymous:1992:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "503--525",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:15:21 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1992:RIPc,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "36",
number = "3",
pages = "527--529",
month = may,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Donofrio:1992:P,
author = "N. M. Donofrio",
title = "Preface",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "533--534",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:13:21 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: ``System\slash 390 architecture''.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Calta:1992:ESC,
author = "S. A. Calta and S. A. deVeer and E. Loizides and R. N.
Strangewayes",
title = "{Enterprise Systems Connection} ({ESCON}) Architecture
--- System overview",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "535--551",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper introduces an IBM data processing
interconnection system called Enterprise Systems
Connection (ESCON) Architecture. Utilizing
state-of-the-art fiber optic technology, the ESCON
system introduces a unique concept to computer
interconnection topology, the dynamic switched
point-to-point connection. A comprehensive solution to
the interconnection of data processing equipment and
systems, the ESCON system offers superior connectivity,
bandwidth, distance, and ease of installation. The
ESCON architecture is directed toward the structuring
of large dispersed multisystem data processing centers
with campus distributed user communities, but it is
equally well suited to the needs of small processing
configurations. The paper first reviews the objectives
of the ESCON development and then gives a more detailed
discussion of the system design alternatives and
choices which were made. Topics discussed are the fiber
optic technology, the interconnection topology, the
ESCON architecture, and the design of the major system
elements.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); C5620L (Local area networks)",
classification = "B6210L (Computer communications); B6260 (Optical
links and equipment); C5620L (Local area networks)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "alternatives; campus distributed user communities;
Campus distributed user communities; centers; computer;
Computer interconnection topology; connection; dynamic
switched point-to-point; Dynamic switched
point-to-point connection; Enterprise; Enterprise
Systems Connection; ESCON; fiber optic technology;
Fiber optic technology; IBM computers; IBM data
processing interconnection system; interconnection
networks; interconnection topology; large dispersed
multisystem data processing; Large dispersed
multisystem data processing centers; local area
networks; multiprocessor; optical links; system design;
System design alternatives; Systems Connection",
thesaurus = "IBM computers; Local area networks; Multiprocessor
interconnection networks; Optical links",
treatment = "P Practical; R Product Review",
xxauthor = "S. A. Calta and J. A. {de Veer} and E. Loizides and R.
N. Strangwayes",
}
@Article{Aulet:1992:IES,
author = "N. R. Aulet and D. W. Boerstler and G. DeMario and F.
D. Ferraiolo and C. E. Hayward and C. D. Heath and A.
L. Huffman and W. R. Kelly and G. W. Peterson and D. J.
{Stigliani, Jr.}",
title = "{IBM Enterprise Systems} multimode fiber optic
technology",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "553--576",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes the first implementation of
optical fiber technology for the I/O channel
connections of the IBM Enterprise System Connection
(ESCON) Architecture. The ESCON optical link line rate
is 200 megabits per second and is capable of
transmission over distances of 3 km. The link is
composed of a serializer, electro-optic transmitter,
duplex fiber optic cable, electro-optic receiver, and
deserializer. The serializer and deserializer
respectively perform the conversions from parallel to
serial and serial to parallel formats. The clock which
is used to retime the serial data in the deserializer
is extracted from the encoded serial signal using a
phase-locked loop (PLL) technique. The optical link
technology selected to achieve the data processing
system requirements is InGaAsP-InP 1300-nm LED,
InGaAsP-InP PIN photodiode, and multimode optical
fiber. A duplex fiber jumper cable is designed with a
rugged, low profile, polarized connector, with a unique
protective cap which recedes as it is mated. The
optical link loss budget is determined by dividing the
link into two major categories: available optical power
and cable plant loss. The link design ensures that the
minimum available power is greater than the maximum
cable plant loss. The design parameters and trade-offs
of the optical link are discussed. Unique measurement
techniques and tools to ensure reliable and consistent
link performance are described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "InGaAsP-InP/int InGaAsP/int InP/int As/int Ga/int
In/int P/int InGaAsP/ss As/ss Ga/ss In/ss P/ss InP/bin
In/bin P/bin",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); C5620L (Local area networks)",
classification = "B6210L (Computer communications); B6260 (Optical
links and equipment); C5620L (Local area networks)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "200 Mbit/s; clock; Clock; deserializer; Deserializer;
duplex fiber; duplex fiber jumper cable; Duplex fiber
jumper cable; Duplex fiber optic cable; electro-optic
receiver; Electro-optic receiver; electro-optic
transmitter; Electro-optic transmitter; encoded serial
signal; Encoded serial signal; ESCON; I/O channel
connections; IBM Enterprise System Connection;
InGaAsP-InP; local area networks; measurement
techniques; Measurement techniques; multimode fiber
optic technology; Multimode fiber optic technology;
optic cable; optical fiber technology; Optical fiber
technology; optical link; Optical link technology;
optical links; phase-locked loop; Phase-locked loop;
photodiode; Photodiode; serializer; Serializer;
technology",
numericalindex = "Bit rate 2.0E+08 bit/s",
thesaurus = "Local area networks; Optical links",
treatment = "P Practical",
}
@Article{Elliott:1992:IES,
author = "J. C. Elliott and M. W. Sachs",
title = "The {IBM Enterprise Systems Connection} ({ESCON})
Architecture",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "577--591",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM Enterprise Systems Connection (ESCON)
Architecture is the architecture for the new fiber
optic serial-I/O channels for the processors in the IBM
System/390 family. The architecture is based on message
exchanges, which replace the byte-oriented protocols of
the predecessor parallel interface architecture. Its
interconnection topology employs a dynamic crosspoint
switch. The paper describes the major functional
components of the architecture and discusses some of
the technical problems that were solved during its
development.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); C5620L (Local area networks)",
classification = "B6210L (Computer communications); B6260 (Optical
links and equipment); C5620L (Local area networks)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Dynamic crosspoint switch; dynamic crosspoint switch;
ESCON; fiber optic serial-; Fiber optic serial-I/O
channels; I/O channels; IBM computers; IBM Enterprise
Systems Connection; IBM System/390; interconnection
topology; Interconnection topology; local area
networks; Message exchanges; message exchanges; optical
links",
thesaurus = "IBM computers; Local area networks; Optical links",
treatment = "P Practical; R Product Review",
}
@Article{Georgiou:1992:IES,
author = "C. J. Georgiou and T. A. Larsen and P. W. Oakhill and
B. Salimi",
title = "The {IBM Enterprise Systems Connection ({ESCON})
Director}: a dynamic switch for 200{Mb/s} fiber optic
links",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "593--616",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper describes the function and hardware
structure of the Enterprise Systems Connection (ESCON)
Director, an I/O switch capable of providing dynamic,
nonblocking, any-to-any connectivity for up to 60 fiber
optic links operating at 200 Mb/s. Optoelectronic
conversion at the switch ports allows the switching of
the fiber optic links to be done electronically. The
establishment of paths in the switching matrix is done
by means of a hard-wired, pipelined controller at a
maximum rate of five million connections/disconnections
per second. Routing information is provided in the
header of data frames. The switch-port function,
switching matrix, and matrix controller were
implemented in the IBM 1-$\mu$m CMOS `standard cell'
technology. The paper discusses the system
interconnection philosophy, details of the data flow,
the switch hardware architecture, the design
methodology, and the approach to technology
implementation.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); B6230Y (Other switching centres);
C5620L (Local area networks); C5610N (Network
interfaces)",
classification = "B6210L (Computer communications); B6230Y (Other
switching centres); B6260 (Optical links and
equipment); C5610N (Network interfaces); C5620L (Local
area networks)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "200; 200 Mbit/s; CMOS; Connection; controller; data
frames; Data frames; dynamic switch; Dynamic switch;
Enterprise Systems; Enterprise Systems Connection;
ESCON; fiber optic links; Fiber optic links; I/O
switch; local area networks; matrix; Matrix controller;
Mbit/s; network interfaces; optical links; optical
switches; pipelined; Pipelined controller; switch-port
function; Switch-port function; switching matrix;
Switching matrix; system interconnection philosophy;
System interconnection philosophy",
numericalindex = "Bit rate 2.0E+08 bit/s",
thesaurus = "Local area networks; Network interfaces; Optical
links; Optical switches",
treatment = "P Practical",
}
@Article{Flanagan:1992:IES,
author = "J. R. Flanagan and T. A. Gregg and D. F. Casper",
title = "The {IBM Enterprise Systems Connection (ESCON)}
channel --- a versatile building block",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "617--632",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM Enterprise Systems Connection (ESCON)
environment required the design of a single channel
that could be attached to the entire line of Enterprise
System/9000 processors and deliver the performance
required by the top of that line. In addition to the
channel, other functions were needed, such as the ESCON
channel-to-channel adapter. All of these functions were
required to be implemented using the same channel
hardware. The paper describes the key elements of the
IBM ESCON channel design.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); C5620L (Local area networks)",
classification = "B6210L (Computer communications); B6260 (Optical
links and equipment); C5620L (Local area networks)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "channel-to-channel adapter; Channel-to-channel
adapter; Enterprise; Enterprise System/9000; ESCON; IBM
Enterprise Systems Connection; local area networks;
optical links; System/9000",
thesaurus = "Local area networks; Optical links",
treatment = "P Practical",
}
@Article{Cwiakala:1992:MDR,
author = "R. Cwiakala and J. D. Haggar and H. M. Yudenfriend",
title = "{MVS Dynamic Reconfiguration Management}",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "633--646",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper presents an overview of the dynamic
reconfiguration management (DRM) function of MVS/ESA
and its support of the IBM Enterprise System/9000
family of machines. Dynamic reconfiguration management
is the ability to select a new I/O configuration
definition without needing to perform a power-on reset
(POR) of the hardware or an initial program load (IPL)
of the MVS operating system. Dynamic reconfiguration
management allows the installation to add, delete, or
modify definitions for channel paths, control units,
and I/O devices, in both the software and hardware I/O
configurations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems)",
classification = "C6150N (Distributed systems)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "channel paths; Channel paths; control units; Control
units; dynamic reconfiguration management; Dynamic
reconfiguration management; Enterprise System/9000;
ESCON; I/O configuration; IBM; IBM Enterprise
System/9000; initial program load; Initial program
load; MVS/ESA; network operating systems; operating
system; Operating system; power-on reset; Power-on
reset",
thesaurus = "Network operating systems",
treatment = "P Practical",
}
@Article{Coleman:1992:FDD,
author = "J. J. Coleman and C. B. Meltzer and J. L. Weiner",
title = "{Fiber Distributed Data Interface} attachment to
{System}\slash 390",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "647--654",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A fundamental standard that enables System/390 to
participate in heterogeneous systems environments is
the Fiber Distributed Data Interface (FDDI), defined by
ANSI. The initial IBM offering in support of FDDI is
attachment to System/390 machines via the 3172
Interconnect Controller. FDDI provides a
high-performance alternative to lower-speed local area
networks (LANs) for attachment of workstations to
System/390 mainframes. A key feature of the 3172 Micro
Channel (MC) controller is its internal bus structure,
derived from PS/2 technology. The 3172 FDDI adapter is
capable of data rates up to 80 megabytes per second
(MBps). This should be sufficient to support multiple
FDDI LANs at their rated speed of 10 MBps. Also,
because of its MC orientation, the 3172 FDDI adapter is
potentially extendable to other platforms derived from
PS/2 and RISC System/6000 technology.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6260 (Optical links
and equipment); C5620L (Local area networks); C5610N
(Network interfaces)",
classification = "B6210L (Computer communications); B6260 (Optical
links and equipment); C5610N (Network interfaces);
C5620L (Local area networks)",
corpsource = "IBM Enterprise Syst., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3172 FDDI adapter; 3172 Interconnect Controller; 3172
Micro Channel; 80 MByte/s; data rates; Data rates;
FDDI; Fiber Distributed Data Interface; heterogeneous;
Heterogeneous systems environments; internal bus;
Internal bus structure; local area networks; Local area
networks; network interfaces; open systems; optical
links; PS/2 technology; structure; System/390; systems
environments",
numericalindex = "Byte rate 8.0E+07 Byte/s",
thesaurus = "FDDI; Local area networks; Network interfaces; Open
systems; Optical links",
treatment = "P Practical",
}
@Article{Dhondy:1992:CTC,
author = "Noshir R. Dhondy and Richard J. Schmalz and Ronald M.
{Smith, Sr.} and Julian Thomas and Phil Yeh",
title = "Coordination of time-of-day clocks among multiple
systems",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "655--665",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM Enterprise Systems Architecture/390
External-Time-Reference (ETR) architecture facilitates
the synchronization of time-of-day (TOD) clocks to
ensure consistent time-stamp data in an installation
with multiple systems. The ETR architecture also
provides a means by which the TOD clocks can be set
automatically, without human intervention, to an
accurate standard time source. The paper reviews the
design considerations involved in providing these
functions along with `clock integrity' and continuous
operation-as a consistent extension of the System/390
TOD-clock architecture. The paper also provides a
functional description of the IBM 9037 Sysplex Timer,
which is an implementation of the sending unit of the
ETR network.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems); C6150E (General utility
programs); C5620L (Local area networks)",
classification = "C5620L (Local area networks); C6150E (General
utility programs); C6150N (Distributed systems)",
corpsource = "IBM Enterprise Syst., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Architecture/390; External-Time-Reference; IBM 9037
Sysplex Timer; IBM Enterprise Systems; IBM Enterprise
Systems Architecture/390; local area networks; Multiple
systems; multiple systems; network operating systems;
synchronisation; synchronization; Synchronization;
Time-of-day clocks; time-of-day clocks; time-stamp
data; Time-stamp data; utility programs",
thesaurus = "Local area networks; Network operating systems;
Synchronisation; Utility programs",
treatment = "P Practical",
}
@Article{Swanson:1992:MEC,
author = "M. D. Swanson and C. P. Vignola",
title = "{MVS\slash ESA} coupled-systems considerations",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "667--682",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "One of the most important future MVS environments will
be to provide on-line transaction processing and
decision support through the use of large data
`warehouses' in heterogeneous networks. To provide the
large capacity and high availability required for this
environment, it will be necessary to use multiple,
cooperating MVS systems to provide those services. The
design of such coupled MVS systems must accommodate a
number of factors related to both the general
environment and the user's needs, including
availability, growth, granularity and scale, systems
management, migration and coexistence, and
single-system images. The authors describe the system
services available with MVS/ESA SP Version 4 that can
support the coupled-systems environment, and discuss
how those services can be exploited.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems)",
classification = "C6150N (Distributed systems)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "4; coupled-systems environment; Coupled-systems
environment; decision support; Decision support;
heterogeneous networks; Heterogeneous networks; MVS
environments; MVS/ESA SP Version; MVS/ESA SP Version 4;
network operating systems; system services; System
services; transaction processing; Transaction
processing",
thesaurus = "Network operating systems",
treatment = "P Practical",
}
@Article{Smith:1992:ICF,
author = "R. M. {Smith, Sr.} and P. C. Yeh",
title = "{Integrated Cryptographic Facility} of the {Enterprise
Systems Architecture\slash 390}: design
considerations",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "683--693",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The paper reviews the considerations that shaped the
design of the Enterprise Systems Architecture/390
Integrated Cryptographic Facility. It describes design
issues, alternatives, and decisions, and it provides
the rationale behind some of the decisions. Issues
related to performance, security, usability, and
availability are covered.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210L (Computer communications); B6120B (Codes);
C5620L (Local area networks); C6150N (Distributed
systems); C6130E (Data interchange)",
classification = "B6120B (Codes); B6210L (Computer communications);
C5620L (Local area networks); C6130E (Data
interchange); C6150N (Distributed systems)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Architecture/390; availability; Availability;
Cryptographic Facility; cryptography; Enterprise
Systems; Integrated; Integrated Cryptographic Facility;
local area networks; network operating systems;
performance; Performance; security; Security;
usability; Usability",
thesaurus = "Cryptography; Local area networks; Network operating
systems",
treatment = "P Practical",
xxauthor = "R. M. {Smith, Jr.} and P. C. Yeh",
}
@Article{Gibson:1992:DIS,
author = "D. H. Gibson and G. S. Rao",
title = "Design of the {IBM System}\slash 390 computer family
for numerically intensive applications: An overview for
engineers and scientists",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "695--711",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM System/390, (S/390) computer family provides a
two-order-of-magnitude performance range for
numerically intensive applications. The engineer or
scientist can use the same operating system, compiler,
and run-time environment commonly across the family.
The paper provides an overview of primary S/390
hardware and software products of interest for
numerically intensive applications, including MVS/ESA,
VM/ESA, AIX/ESA, and the extension of FORTRAN for very
large applications and parallel applications. The paper
is focused on details of design interest in three
specific hardware products within the S/390 family,
with emphasis on the Enterprise System/9000 (ES/9000)
Model 900. Also described is a potential
parallel-computing configuration using the ESCON
Director. The paper concludes with a discussion of the
generic system environments within which S/390 products
can support the technical user.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "C5420 (Mainframes and minicomputers)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AIX/ESA; applications; compiler; Compiler; computer
evaluation; Enterprise; Enterprise System/9000;
environment; ES/9000; ESCON Director; FORTRAN; IBM
computers; IBM System/390; mainframes; MVS/ESA;
numerically intensive; Numerically intensive
applications; Operating system; operating system;
parallel-computing configuration; Parallel-computing
configuration; Performance range; performance range;
run-time; Run-time environment; System/9000; VM/ESA",
thesaurus = "Computer evaluation; IBM computers; Mainframes",
treatment = "P Practical; R Product Review",
}
@Article{Liptay:1992:DIE,
author = "J. S. Liptay",
title = "Design of the {IBM Enterprise System}\slash 9000
high-end processor",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "713--731",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The `high-end' water-cooled processors in the IBM
Enterprise System/9000 product family use a CPU
organization and cache structure which depart
significantly from previous designs. The CPU
organization includes multiple execution elements which
execute instructions out of sequence, and uses a new
virtual register management algorithm to control them.
It also contains a branch history table to remember
recent branches and their target addresses so that
instruction fetching and decoding can be directed more
accurately. These models also use a two-level cache
structure which provides a level 1 cache associated
with each processor and a level 2 cache associated with
central storage. The level 1 cache uses a store-through
organization, and is split into two separate caches,
one used for instruction fetching and the other for
operand references. The level 2 cache uses a store-in
method to handle stores.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers)",
classification = "C5420 (Mainframes and minicomputers)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Branch history table; branch history table; buffer
storage; cache structure; Cache structure; computer
evaluation; CPU organization; Decoding; decoding;
fetching; high-end processor; High-end processor; IBM
computers; IBM Enterprise System/9000; instruction;
Instruction fetching; mainframes; operand; Operand
references; processors; references; register
management; Store-through organization; store-through
organization; virtual; Virtual register management;
water-cooled; Water-cooled processors",
thesaurus = "Buffer storage; Computer evaluation; IBM computers;
Mainframes",
treatment = "P Practical; R Product Review",
}
@Article{Dao-Trong:1992:SCI,
author = "S. Dao-Trong and K. Helwig",
title = "A single-chip {IBM} System\slash 390 floating-point
processor in {CMOS}",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "733--749",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A floating-point processor with the IBM System\slash
390 architecture is implemented in one CMOS VLSI chip
containing over 70000 cells (equivalent inverters),
using a transistor channel length of 0.5 mu m. All
floating-point instructions are hard-wired, including
the binary integer multiplications. The chip is
implemented in a 1- mu m technology with three layers
of metal. All circuits are realized in standard cells
except for a floating-point register and a multiplier
array macro, which are custom designed to save chip
area. Instructions are performed in a five-stage
pipeline with a maximum operating frequency of 37 MHz.
The chip measures 12.7 mm*12.7 mm, and dissipates 2 W.
It is part of the chip set which forms the core of the
IBM Enterprise System\slash 9000 Type 9221 entry-level
models.",
acknowledgement = ack-nhfb,
affiliation = "IBM Germany, Boeblingen, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5130 (Microprocessor
chips); C5230 (Digital arithmetic methods)",
classification = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5130 (Microprocessor
chips); C5230 (Digital arithmetic methods)",
corpsource = "IBM Germany, Boeblingen, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "37 MHz; binary; Binary integer multiplications; chip
set; Chip set; CMOS; CMOS integrated circuits; digital
arithmetic; Enterprise System/9000; equipment;
equivalent inverters; Equivalent inverters; evaluation;
five-stage pipeline; Five-stage pipeline; IBM; IBM
computers; IBM Enterprise System/9000; IBM Enterprise
System\slash 9000; integer multiplications;
microprocessor chips; single-chip IBM system/390
floating-point processor; Single-chip IBM System/390
floating-point processor; Single-chip IBM System\slash
390 floating-point processor; transistor channel
length; Transistor channel length",
numericalindex = "Frequency 3.7E+07 Hz",
thesaurus = "CMOS integrated circuits; Digital arithmetic;
Equipment evaluation; IBM computers; Microprocessor
chips",
treatment = "P Practical; R Product Review",
}
@Article{Ackerman:1992:SIE,
author = "D. F. Ackerman and M. H. Decker and J. J. Gosselin and
K. M. Lasko and M. P. Mullen and R. E. Rosa and E. V.
Valera and B. Wile",
title = "Simulation of {IBM Enterprise System\slash 9000}
models 820 and 900",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "751--764",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The discovery and removal of logic design errors early
in the development cycle is critical to timely
availability of market-driven processor products. The
paper describes the part played by simulation in the
verification of the high-end models of the IBM
Enterprise System/9000 (ES/9000) processor family, and
how that effort advanced the state of the art of logic
design simulation. The increased complexity of the
ES/9000 design over that of the IBM Enterprise
System/3090 (ES/3090) necessitated a larger simulation
effort. New tools and methods were developed. Two
simulation missions were established. Element
simulation addressed ES/9000 functional elements (e.g.
the storage controller) individually using the Compiled
Enhanced Functional Simulator (CEFS), a software tool.
System simulation tested two or more functional
elements together using the Engineering Verification
Engine (EVE), a special-purpose hardware parallel
processor, and an attached IBM 3092 Processor
Controller (PCE). The results achieved by simulation
are discussed, together with the methods used and the
impact these results had on the overall verification of
the ES/9000 Models 820 and 900.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5470 (Performance evaluation and testing); C7430
(Computer engineering); C5210 (Logic design methods);
C5420 (Mainframes and minicomputers)",
classification = "C5210 (Logic design methods); C5420 (Mainframes and
minicomputers); C5470 (Performance evaluation and
testing); C7430 (Computer engineering)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Compiled Enhanced Functional Simulator; computer
testing; development cycle; Development cycle;
Engineering Verification Engine; formal verification;
high-end models; High-end models; IBM computers; logic;
logic design errors; Logic design errors; logic design
simulation; Logic design simulation; mainframes;
simulation; Simulation; software tool; Software tool;
storage controller; Storage controller; testing;
verification; Verification; virtual machines",
thesaurus = "Computer testing; Formal verification; IBM computers;
Logic testing; Mainframes; Virtual machines",
treatment = "P Practical",
}
@Article{Chen:1992:FDI,
author = "C. L. Chen and N. N. Tendolkar and A. J. Sutton and M.
Y. Hsiao and D. C. Bossen",
title = "Fault-tolerance design of the {IBM Enterprise
System\slash 9000} type 9021 processors",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "765--779",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The 9021-type processors offer the highest performance
of the IBM Enterprise System/9000 (ES/9000) series.
They also have the highest levels of concurrent error
detection, fault isolation, recovery, and availability
of any IBM general-purpose processor. High availability
is achieved by minimizing component failure rates
through improvements of the base technology, and design
techniques that permit hard and soft failure detection,
recovery and isolation, and component replacement
concurrent with system operation. The authors discuss
fault-tolerant design techniques for array, logic, and
storage subsystems. They also present diagnostic
strategy, fault isolation, and recovery techniques. New
features such as the redundant power system and
Processor Availability Facility are described. The
overall recovery design is described, as well as
specific implementation schemes. The design process to
verify the error detection, fault isolation, and
recovery is also described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5470 (Performance evaluation and testing); C5420
(Mainframes and minicomputers)",
classification = "C5420 (Mainframes and minicomputers); C5470
(Performance evaluation and testing)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "9021 processors; 9021 Processors; array; Array;
availability; Availability; concurrent error detection;
Concurrent error detection; diagnostic strategy;
Diagnostic strategy; ES/9000; fault isolation; Fault
isolation; fault tolerant computing; fault-tolerant
design techniques; Fault-tolerant design techniques;
IBM computers; IBM Enterprise System/9000; mainframes;
Processor Availability Facility; rates; Rates;
recovery; Recovery; recovery design; Recovery design;
redundant power system; Redundant power system;
system",
thesaurus = "Fault tolerant computing; IBM computers; Mainframes;
System recovery",
treatment = "P Practical",
}
@Article{Covi:1992:TFC,
author = "K. R. Covi",
title = "Three-loop feedback control of fault-tolerant power
supplies in {IBM Enterprise System\slash 9000}
processors",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "781--789",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In an Enterprise System/9000 (ES/9000) processor, a
fault-tolerant power system composed a multiple power
supplies connected in parallel provides thousands of
amperes of current to low-voltage (1-2 V) logic circuit
boards, monitors the voltage at each board, and
immediately responds to compensate for failure of a
supply. If a supply fails, the very fast closed-loop
response redistributes the current uniformly among the
remaining supplies and allows the normal functioning of
the processor logic to continue uninterrupted. This
rapid response is not obtained from a conventional
two-loop (current-mode) feedback power supply because
the loop bandwidth is restricted by a resonance that
develops in the power distribution. A third feedback
loop that is added to each supply controls this power
distribution resonance and makes possible the wide loop
bandwidth necessary to achieve the required power
system control. Analysis is presented of a three-loop
control system, and a simulation of its application to
a typical ES/9000 power system is described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Kingston, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C5150 (Other
circuits for digital computers); C5470 (Performance
evaluation and testing)",
classification = "C5150 (Other circuits for digital computers); C5420
(Mainframes and minicomputers); C5470 (Performance
evaluation and testing)",
corpsource = "IBM Enterprise Syst., Kingston, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bandwidth; boards; Enterprise System/9000 processors;
ES/9000; fault tolerant computing; fault-tolerant power
supplies; Fault-tolerant power supplies; feedback
control; Feedback control; IBM; IBM computers; IBM
Enterprise System/9000 processors; logic circuit; Logic
circuit boards; loop; Loop bandwidth; mainframes;
monitors; Monitors; power; supplies to apparatus;
three-loop control system; Three-loop control system;
very fast closed-loop response; Very fast closed-loop
response",
thesaurus = "Fault tolerant computing; IBM computers; Mainframes;
Power supplies to apparatus",
treatment = "P Practical",
}
@Article{Delia:1992:SCD,
author = "D. J. Delia and T. C. Gilgert and N. H. Graham and U.
Hwang and P. W. Ing and J. C. Kan and R. G. Kemink and
G. C. Maling and R. F. Martin and K. P. Moran and J. R.
Reyes and R. R. Schmidt and R. A. Steinbrecher",
title = "System cooling design for the water-cooled {IBM
Enterprise System\slash 9000} processors",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "791--803",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The high operating speed and corresponding high chip
heat fluxes in the IBM Enterprise System/9000
water-cooled mainframe processors are made possible by
improvements in component- and system-level cooling.
The heart of the closed-loop water-cooling system is a
coolant distribution frame (CDF) common to all
water-cooled processors. The CDF provides a controlled
water temperature of 21.7 degrees C to the central
electronic complex (CEC) at water flow rates up to 245
liters per minute (lpm) and rejects heat loads of up to
63 kW for the largest processor. The water flow
provides cooling to multichip thermal conduction
modules (TCMs), to power supplies, and to air-to-water
heat exchangers that provide preconditioned air to
channel and memory cards. As many as 121 chips are
mounted on a TCM glass-ceramic substrate, with chip
powers reaching 27 W or a heat flux of 64 W/cm/sup 2/.
A separable cold plate was developed to cool these
modules. The power supplies with high heat densities
are primarily cooled by water which flows through a
unique separable cold plate designed for ease of
serviceability of the power supply. A closed-loop frame
in which all the heat was rejected to water was
developed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C5490 (Other
aspects)",
classification = "C5420 (Mainframes and minicomputers); C5490 (Other
aspects)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "21.7 deg C; central electronic; Central electronic
complex; ceramic substrate; closed-loop water-cooling;
Closed-loop water-cooling system; cold plate; Cold
plate; complex; coolant distribution frame; Coolant
distribution frame; cooled mainframe processors;
cooling; heat flux; Heat flux; IBM computers;
mainframes; multichip thermal conduction modules;
Multichip thermal conduction modules; system; TCM
glass-; TCM glass-ceramic substrate; water-;
water-cooled IBM Enterprise System/9000 processors;
Water-cooled IBM Enterprise System/9000 processors;
Water-cooled mainframe processors",
numericalindex = "Temperature 2.95E+02 K",
thesaurus = "Cooling; IBM computers; Mainframes",
treatment = "P Practical",
}
@Article{Goth:1992:DDM,
author = "G. F. Goth and M. L. Zumbrunnen and K. P. Moran",
title = "Dual-tapered-piston ({DTP}) module cooling for {IBM
Enterprise System\slash 9000} systems",
journal = j-IBM-JRD,
volume = "36",
number = "4",
pages = "805--816",
month = jul,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The water-cooled thermal conduction modules (TCMs) in
the IBM Enterprise System/9000 (ES/9000) systems
require a fourfold thermal improvement over TCMs in the
3090 system. An examination of the thermal/mechanical
tolerance relationships among the chips, substrate, and
cooling hardware showed that a cylindrical piston would
not meet this requirement. The piston was redesigned
with a cylindrical center section and a taper on each
end. This shape minimizes the gap between the piston
and `hat' while retaining intimate contact between the
piston face and chip surface during all assembly
conditions. Numerical and analytical models demonstrate
that this new piston shape, coupled with improved
conductivity of the cooling hardware materials, exceeds
ES/9000 system needs. These models were verified by
tests conducted on single-site and full-scale modules
in the laboratory and by tests on actual ES/9000
systems.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5420 (Mainframes and minicomputers); C5490 (Other
aspects)",
classification = "C5420 (Mainframes and minicomputers); C5490 (Other
aspects)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chips; Chips; cooling; cooling hardware; Cooling
hardware; cylindrical piston; Cylindrical piston;
ES/9000; IBM computers; IBM Enterprise; IBM Enterprise
System/9000; mainframes; substrate; Substrate;
System/9000; water-cooled thermal conduction modules;
Water-cooled thermal conduction modules",
thesaurus = "Cooling; IBM computers; Mainframes",
treatment = "P Practical",
}
@Article{Attardo:1992:PES,
author = "M. J. Attardo",
title = "Preface: {ES\slash 9000} Semiconductor and Packaging
Technologies",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "819--820",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue ``ES\slash 9000 semiconductor and
packaging technologies''.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brown:1992:ASA,
author = "K. H. Brown and D. A. Grose and R. C. Lange and T. H.
Ning and P. A. Totta",
title = "Advancing the state of the art in high-performance
logic and array technology",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "821--828",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "High-speed silicon bipolar technology continues to
meet the demands of integrated circuits for mainframe
computers. IBM has developed an advanced bipolar logic
and high-speed array technology for its Enterprise
System/9000 systems. This technology, code-named ATX-4,
is composed of trench-isolated, double-polysilicon
self-aligned bipolar devices, and has four fully
planarized wiring levels with interlevel connecting
studs. Chip fabrication has been implemented in
1-$\mu$m ground rules and is in full-scale
manufacturing. ATX-4 represents a significant advance
in providing higher-speed and lower-power logic at
increased levels of integration compared with that of
the ATX-1 technology used in previous generations. An
overview of the design and integration of ATX-4 is
discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits)C5120 (Logic and switching circuits); C5420
(Mainframes and minicomputers)",
classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits); C5120 (Logic and switching circuits); C5420
(Mainframes and minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1 micron; 1 Micron; ATX-4; bipolar integrated
circuits; chip fabrication; Chip fabrication; double;
Double polycrystalline Si devices; full-scale
manufacturing; Full-scale manufacturing; ground rules;
Ground rules; high speed; High speed Si bipolar logic;
high-; High-performance logic; high-speed array
technology; High-speed array technology; IBM computers;
IBM Enterprise System/9000; integration levels;
Integration levels; interlevel connecting studs;
Interlevel connecting studs; isolated self aligned
bipolar devices; logic arrays; mainframes; performance
logic; planarized wiring levels; Planarized wiring
levels; polycrystalline Si devices; Si bipolar logic;
trench; Trench isolated self aligned bipolar devices;
wiring",
numericalindex = "Size 1.0E-06 m",
thesaurus = "Bipolar integrated circuits; IBM computers; Logic
arrays; Mainframes; Wiring",
treatment = "P Practical",
}
@Article{Barish:1992:IPI,
author = "A. E. Barish and J. P. Eckhardt and M. D. Mayo and W.
A. Svarczkopf and S. P. Gaur",
title = "Improved performance of {IBM Enterprise System}\slash
9000 bipolar logic chips",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "829--834",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The performance required for logic gate arrays by the
IBM Enterprise System/9000 (ES/9000) family of
water-cooled processors was obtained by redesigning
chips that previously consisted of emitter-coupled
logic (ECL) circuits. Multiple bipolar logic circuit
families were implemented for the first time on a
single IBM chip by using a modular cell approach. In
60\% of the ECL circuits, AC coupling in ECL gates
reduced the maximum operating power per ECL circuit on
ES/9000 chips by 50\% and decreased the signal delay
per loaded gate by 30\%, to 150 ps. About 10-20\% of
the remaining ECL circuits were replaced by
differential current switches (DCS) which dissipated
less power and improved the overall chip performance.
Circuits to communicate between ECL and DCS circuit
families and to improve DCS circuit reliability were
included on the ES/9000 chips without affecting logic
function density.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits)C5120 (Logic and switching circuits); C5420
(Mainframes and minicomputers)",
classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
circuits); C5120 (Logic and switching circuits); C5420
(Mainframes and minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arrays; bipolar integrated circuits; bipolar logic
chips; Bipolar logic chips; chip performance; Chip
performance; circuit reliability; Circuit reliability;
coupled logic; delays; differential current;
Differential current switches; ECL gates; emitter-;
Emitter-coupled logic; function density; IBM computers;
IBM Enterprise System/9000; logic; Logic function
density; logic gate arrays; Logic gate arrays;
mainframes; maximum; Maximum operating power; modular
cell approach; Modular cell approach; operating power;
power dissipation; Power dissipation; signal delay;
Signal delay; switches; water-cooled processors;
Water-cooled processors",
thesaurus = "Bipolar integrated circuits; Delays; IBM computers;
Logic arrays; Mainframes",
treatment = "P Practical",
}
@Article{Booth:1992:SAQ,
author = "R. M. {Booth, Jr.} and K. A. Tallman and T. J.
Wiltshire and P. L. Yee",
title = "A statistical approach to quality control of
non-normal lithographical overlay distributions",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "835--844",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "To achieve the high reliability and performance
required by integrated circuit chips in IBM Enterprise
System/9000 processors, lithography tool centerline
overlay variations between masking levels were
specified at +or-0.3$\mu$m, and circuit design images
were transferred with 5* step-and-repeat
photolithography tools. In contrast to data obtained
from 1* lithography tools, the level-to-level overlay
data which characterize deviations from circuit design
rules did not fit a normal distribution, and quality
control was not achieved with traditional statistical
procedures. A methodology was empirically developed
which transformed measured data into worst-case overlay
points and approximated the data by a gamma
distribution. More than 80\% of the worst-case
distributions were fit by the gamma distribution. The
transformation of chip worst-case overlay data and the
quality control testing applicable to 5*
step-and-repeat lithography tool processes are
described in this paper.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits); B0170L (Inspection and quality control)",
classification = "B0170L (Inspection and quality control); B2550G
(Lithography); B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit; circuit chips; circuit design images; Circuit
design images; Circuit design rules; design rules;
gamma distribution; Gamma distribution; IBM computers;
IBM Enterprise System/9000 processors; integrated;
Integrated circuit chips; integrated circuit testing;
level-to-level overlay data; Level-to-level overlay
data; levels; lithography tool centerline overlay
variations; Lithography tool centerline overlay
variations; masking; Masking levels; nonnormal
distributions; Nonnormal distributions;
photolithography; photolithography tools; quality
control; quality control testing; Quality control
testing; statistical approach; Statistical approach;
statistics; step-and-repeat; Step-and-repeat
photolithography tools; worst-case overlay points;
Worst-case overlay points",
thesaurus = "IBM computers; Integrated circuit testing;
Photolithography; Quality control; Statistics",
treatment = "P Practical",
}
@Article{Guthrie:1992:FVB,
author = "W. L. Guthrie and W. J. Patrick and E. Levine and H.
C. Jones and E. A. Mehter and T. F. Houghton and G. T.
Chiu and M. A. Fury",
title = "A four-level {VLSI} bipolar metallization design with
chemical-mechanical planarization",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "845--857",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A high-performance four-level semiconductor device
wiring fabrication process has been developed for
bipolar devices in Enterprise System/9000 (ES/9000)
processors. The reliable interconnection of large
numbers of devices on a single integrated circuit chip
has been enhanced by planarizing insulators and metals
using chemical-mechanical polishing processes, by a
novel contact stud structure, and by a Ti-clad Al-Cu
metallurgy. This paper describes the structure of the
four-level wiring and elements of the process,
including the silicon contacts, techniques for
depositing metal and oxide to cover features with high
aspect ratios, high-temperature fine-line lift-off
stencils, and high-density, area array solder
terminals.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Ti/el; AlCu/bin Al/bin Cu/bin; Si/int Si/el",
classcodes = "B2550F (Metallisation); B2570B (Bipolar integrated
circuits)",
classification = "B2550F (Metallisation); B2570B (Bipolar integrated
circuits)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AlCu metallurgy; array solder terminals; Array solder
terminals; aspect ratios; Aspect ratios; bipolar
integrated circuits; chemical-mechanical planarization;
Chemical-mechanical planarization; contact stud
structure; Contact stud structure; deposition;
Deposition techniques; four-level VLSI bipolar
metallization design; Four-level VLSI bipolar
metallization design; high-temperature fine-;
High-temperature fine-line lift-off stencils; IBM
computers; IBM Enterprise System/9000 processors;
insulators; Insulators; integrated circuit chip;
Integrated circuit chip; line lift-off stencils;
metallisation; metals; Metals; polishing; Polishing;
reliable interconnection; Reliable interconnection;
semiconductor device; Semiconductor device wiring
fabrication process; Si contacts; techniques; Ti
cladding; VLSI; wiring; wiring fabrication process",
thesaurus = "Bipolar integrated circuits; IBM computers;
Metallisation; VLSI; Wiring",
treatment = "P Practical",
}
@Article{Bunce:1992:DTM,
author = "P. Bunce and W. Chin and L. Clark and B. Krumm",
title = "{Directory} and {Trace} memory chip with active
discharge cell",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "859--865",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The Directory and Trace memory chip is a 7.1 Kb static
random-access memory with 28-bit field simultaneous
compare function and independent read and write 28-bit
field addressing. The array is organized as four 64 by
28 subarrays. It incorporates a unique Schottky barrier
diode (SBD)-coupled cell with active discharge. As
memory cells are reduced in size with each new
generation, soft errors become a major concern. One
method of providing high soft-error immunity is to
operate the memory cell transistors in the saturation
region. However, in order to write data into such
memory cells, the saturation capacitance in the memory
cell transistors must be discharged. In prior art, such
a capacitive transistor-saturation discharge was
accompanied by increased power consumption and/or
delay. Typically, the new data signals themselves are
used to overcome this saturation capacitance. In this
design, a unique SBD-coupled active discharge cell
discharges the conducting transistor saturation
capacitance before writing new data into the cell.
Thus, it enhances the write performance and preserves
the high soft-error immunity of the cell.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); C5320G (Semiconductor
storage)",
classification = "B1265D (Memory circuits); C5320G (Semiconductor
storage)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "28-bit field; 28-Bit field simultaneous compare
function; 7.1; 7.1 Kbit; active discharge cell; Active
discharge cell; capacitance; capacitive
transistor-saturation; Capacitive transistor-saturation
discharge; cell transistors; coupled cell; Directory
and Trace; Directory and Trace memory chip; discharge;
independent read/write addressing; Independent
read/write addressing; integrated memory circuits;
kbit; memory; Memory cell transistors; memory chip;
partial discharges; saturation capacitance; Saturation
capacitance; Schottky barrier diode; Schottky barrier
diode coupled cell; simultaneous compare function;
soft-error immunity; Soft-error immunity; SRAM chips;
static random-access memory; Static random-access
memory; write performance; Write performance",
numericalindex = "Storage capacity 7.3E+03 bit",
thesaurus = "Capacitance; Integrated memory circuits; Partial
discharges; SRAM chips",
treatment = "P Practical",
}
@Article{Chiu:1992:IES,
author = "K. Chiu and J. J. DeFazio and T. G. McNamara",
title = "{IBM Enterprise System}\slash 9000 clock system: a
technology and system perspective",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "867--875",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The minimization of system clock skew is critical to
the overall performance of high-speed computer systems.
This paper discusses the statistical clock skew
calculation methodology employed in the analysis of the
IBM Enterprise System/9000 (ES/9000) computer systems.
Comparisons made to a worst-case design approach show
the advantages of a statistical clock skew calculation
and its use in the timing analysis of ES/9000 systems.
Design techniques that aid in the minimization of
system clock skew are discussed throughout this paper.
While many details concerning these design techniques
and the statistical clock skew calculation methodology
are tutorial in nature and have been used in the design
of past IBM high-end machines, it is hoped that this
paper will give the reader a useful understanding of
the major considerations affecting the clock system and
its application to an ES/9000 system.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5150 (Other circuits for digital computers); C5420
(Mainframes and minicomputers)",
classification = "C5150 (Other circuits for digital computers); C5420
(Mainframes and minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "clocks; High-speed computer systems; high-speed
computer systems; IBM computers; IBM Enterprise; IBM
Enterprise System/9000; mainframes; minimisation;
Minimization; minimization; performance; Performance;
Statistical calculation methodology; statistical
calculation methodology; statistics; System clock skew;
system clock skew; System/9000; timing analysis; Timing
analysis",
thesaurus = "Clocks; IBM computers; Mainframes; Minimisation;
Statistics",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Davidson:1992:PED,
author = "E. E. Davidson and P. W. Hardin and G. A. Katopis and
M. G. Nealon and L. L. Wu",
title = "Physical and electrical design features of the {IBM
Enterprise System}\slash 9000 circuit module",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "877--888",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The requirements of the new TCM (thermal conduction
module) for the IBM Enterprise System/9000 (ES/9000)
module generated a significant number of challenges for
the physical and electrical designer. For example, the
need to support more circuits meant that more signal
and power conductors had to be provided. In addition,
the requirement for faster performance called for
materials with lower dielectric constants and the use
of on-module decoupling capacitors. This paper
describes these changes, the design considerations that
were applied to signal transmission, and the approaches
that were used to contain delta-I and crosstalk noise
in the module. Finally, the test measurements used to
qualify the module are explained. The result is a TCM
that more than doubles the circuit density of the TCM
used for the IBM 3090 machines, with substantially
greater speed and reliability.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); C5150 (Other circuits for
digital computers); C5420 (Mainframes and
minicomputers)",
classification = "B0170J (Product packaging); C5150 (Other circuits
for digital computers); C5420 (Mainframes and
minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit density; Circuit density; circuit module;
Circuit module; crosstalk noise; Crosstalk noise;
decoupling capacitors; Decoupling capacitors; delta-I
noise; Delta-I noise; dielectric constants; Dielectric
constants; electrical design; Electrical design
features; Enterprise System/9000; features; heat
conduction; IBM; IBM 3090; IBM 3090 machines; IBM
computers; IBM Enterprise System/9000; machines;
mainframes; modules; multichip; noise; performance;
Performance; permittivity; physical design features;
Physical design features; power conductors; Power
conductors; reflection noise; Reflection noise;
reliability; Reliability; signal; signal conductors;
Signal conductors; Signal transmission; speed; Speed;
switching noise; Switching noise; thermal conduction
module; Thermal conduction module; transmission",
thesaurus = "Heat conduction; IBM computers; Mainframes; Multichip
modules; Noise; Permittivity",
treatment = "P Practical",
}
@Article{Tummala:1992:HPG,
author = "R. R. Tummala and J. U. Knickerbocker and S. H.
Knickerbocker and L. W. Herron and R. W. Nufer and R.
N. Master and M. O. Neisser and B. M. Kellner and C. H.
Perry and J. N. Humenik and T. F. Redmond",
title = "High-performance glass-ceramic\slash copper multilayer
substrate with thin-film redistribution",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "889--904",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "IBM has pioneered the use of large-area alumina
multilayer ceramic substrates using state-of-the-art
greensheet, molybdenum paste, and tooling technologies
for its mainframe computers since 1980. During this
time, a new generation of substrate materials have been
developed based on copper metallization and a unique
glass that crystallizes to cordierite (2Al$_2$O/sub
3/.2MgO.5SiO$_2$), which has a very low dielectric
constant. The glass-ceramic/copper system provides a
factor of 3 improvement in electrical conductivity over
alumina/molybdenum in previous IBM systems, and the
number of metallized substrate layers has been
increased from 45 to 63. The thermal expansion of the
new substrate (30*10/sup -7/ degrees C/sup -1/) is
matched with that of the silicon chips, thereby
enhancing the reliability of the 78500 solder-bonded
chip-to-substrate connections in the System
390-Enterprise System/9000 computers. Each substrate is
127.5 mm square and can support up to 121 complex logic
and memory chips. The IBM advanced multichip module
dissipates more than twice the heat flux of previous
alumina/multichip modules-to 17 W/cm/sup 2/ at the
package level and 50 W/cm/sup 2/ at the chip level.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al2O3MgOSiO2-Cu/int Al2O3MgOSiO2/int Al2O3/int
SiO2/int Al2/int Al/int Cu/int Mg/int O2/int O3/int
Si/int O/int Al2O3MgOSiO2/ss Al2O3/ss SiO2/ss Al2/ss
Al/ss Mg/ss O2/ss O3/ss Si/ss O/ss Cu/el; Si/int
Si/el",
classcodes = "B2220J (Hybrid integrated circuits); B0170J (Product
packaging); B2220E (Thin film circuits); B0540
(Ceramics and refractories); B0550 (Composite
materials); B0570 (Glasses)",
classification = "B0170J (Product packaging); B0540 (Ceramics and
refractories); B0550 (Composite materials); B0570
(Glasses); B2220E (Thin film circuits); B2220J (Hybrid
integrated circuits)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2/O/sub 3/MgOSiO$_2$-Cu; Advanced multichip module;
advanced multichip module; Al$_2$O/sub 3/MgOSiO$_2$-Cu;
Al/sub; aluminosilicate glasses; ceramics; chips;
composite insulating; connections; constant; cooling;
copper; Cordierite; cordierite; dielectric; Dielectric
constant; Electrical conductivity; electrical
conductivity; expansion; film redistribution;
Glass-ceramic; glass-ceramic; Heat flux dissipation;
heat flux dissipation; IBM computers; IBM System
390-Enterprise System/9000 computers; logic; Logic
chips; materials; Memory chips; memory chips;
metallisation; Metallization; metallization; multichip
modules; Multilayer substrate; multilayer substrate;
permittivity; Reliability; reliability; Si chips;
solder-bonded chip-to-substrate; Solder-bonded
chip-to-substrate connections; substrates; thermal;
Thermal expansion; thin film circuits; thin-; Thin-film
redistribution",
thesaurus = "Aluminosilicate glasses; Ceramics; Composite
insulating materials; Cooling; Copper; IBM computers;
Metallisation; Multichip modules; Permittivity;
Substrates; Thermal expansion; Thin film circuits",
treatment = "P Practical; X Experimental",
}
@Article{Kranik:1992:EAF,
author = "J. R. Kranik and J. J. Fulton and L. Su and S. M.
Zimmerman",
title = "Equipment-related advances in the fabrication of
glass-ceramic\slash copper\slash polyimide substrates",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "905--920",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper pertains to the equipment used to produce
the multilayer glass-ceramic/copper/polyimide
substrates of the thermal conduction modules (TCMs)
used in the IBM Enterprise System/9000 water-cooled
processors. Discussed are a flexible equipment concept
applied to the punching, inspection, and testing of the
glass-ceramic/copper portion of the substrates, and
laser-based equipment for ablation and repair of their
polyimide/copper thin-film portion.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el",
classcodes = "B0170G (General fabrication techniques); B0170J
(Product packaging); B2220C (General fabrication
techniques); B0540 (Ceramics and refractories); B0550
(Composite materials); B0570 (Glasses); B0560 (Polymers
and plastics)",
classification = "B0170G (General fabrication techniques); B0170J
(Product packaging); B0540 (Ceramics and refractories);
B0550 (Composite materials); B0560 (Polymers and
plastics); B0570 (Glasses); B2220C (General fabrication
techniques)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ablation; Ablation; ceramics; composite insulating
materials; copper; Cu; flexible equipment; Flexible
equipment; glass; glass ceramic/Cu/polyimide substrate
fabrication; Glass ceramic/Cu/polyimide substrate
fabrication; heat conduction; IBM computers; IBM
Enterprise; IBM Enterprise System/9000; inspection;
Inspection; integrated circuit; laser-based equipment;
Laser-based equipment; manufacture; multichip modules;
multilayer; Multilayer substrate; polymers; punching;
Punching; repair; Repair; substrate; substrates;
System/9000; testing; Testing; thermal conduction
modules; Thermal conduction modules; water-cooled
processors; Water-cooled processors",
thesaurus = "Ceramics; Composite insulating materials; Copper;
Glass; Heat conduction; IBM computers; Integrated
circuit manufacture; Multichip modules; Polymers;
Substrates",
treatment = "P Practical",
}
@Article{Brofman:1992:ECT,
author = "P. J. Brofman and S. K. Ray and K. F. Beckham",
title = "Electrical connections to the thermal conduction
modules of the {IBM Enterprise System\slash 9000}
water-cooled processors",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "921--933",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In a complex multichip carrier such as the thermal
conduction module (TCM) of IBM high-performance
mainframe processors, the interfaces between chips and
their substrate as well as between the substrate and
its printed circuit board must support a large number
of electrical connections. Since chip, substrate, and
board typically comprise very different materials, the
electrical connections between them must be able to
accommodate considerable thermally induced mechanical
stress during assembly and use. This paper describes
the pin attachment, chip attachment, wire bonding, and
laser deletion processes used for forming the
electrical connections to the
glass-ceramic/copper/polyimide/copper substrate of the
thermal conduction modules of the IBM Enterprise
System/9000 water-cooled processors.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el",
classcodes = "B2240 (Microassembly techniques); B0170J (Product
packaging); C5150 (Other circuits for digital
computers); C5420 (Mainframes and minicomputers)",
classification = "B0170J (Product packaging); B2240 (Microassembly
techniques); C5150 (Other circuits for digital
computers); C5420 (Mainframes and minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "assembly; Assembly; board; bonding; chip attachment;
Chip attachment; chip-substrate interfaces;
Chip-substrate interfaces; cooling; Cu; electrical
connections; Electrical connections; glass
ceramic/Cu/polyimide/Cu; Glass ceramic/Cu/polyimide/Cu
substrate; heat conduction; high-performance mainframe
processors; High-performance mainframe processors; IBM
computers; IBM Enterprise; IBM Enterprise System/9000;
laser deletion processes; Laser deletion processes;
lead bonding; mainframes; multichip carrier; Multichip
carrier; multichip modules; pin attachment; Pin
attachment; printed circuit; Printed circuit board;
stress; substrate; System/9000; thermal conduction
module; Thermal conduction module; thermally induced
mechanical; Thermally induced mechanical stress;
water-cooled processors; Water-cooled processors; wire;
Wire bonding",
thesaurus = "Cooling; Heat conduction; IBM computers; Lead bonding;
Mainframes; Multichip modules",
treatment = "P Practical",
}
@Article{Humenik:1992:LDC,
author = "J. N. Humenik and J. M. Oberschmidt and L. L. Wu and
S. G. Paull",
title = "Low-inductance decoupling capacitor for the thermal
conduction modules of the {IBM Enterprise System\slash
9000} processors",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "935--942",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Multilayer ceramic decoupling capacitors fabricated
using a barium titanate-based dielectric are used with
the glass-ceramic/copper/polyimide substrates of the
thermal conduction modules (TCMs) of the IBM Enterprise
System/9000 processors to suppress the voltage noise
generated by the logic circuits of the semiconductor
chips used in the processors. Use is made of thick-film
multilayer ceramic fabrication processes and thin-film
termination processes to achieve substrate-mounted
capabilities which, when combined with the
low-inductance design of the capacitors, minimize the
inductance of the decoupling paths to their adjacent
chips. When mounted on the
glass-ceramic/copper/polyimide substrate of a
water-cooled TCM, the capacitors suppress approximately
50\% of the voltage noise, thereby enhancing the
performance of the TCMs.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "BaTiO3/ss TiO3/ss Ba/ss O3/ss Ti/ss O/ss; Cu/int
Cu/el",
classcodes = "B2130 (Capacitors); B0170J (Product packaging); B0540
(Ceramics and refractories); B2220J (Hybrid integrated
circuits); B2220C (General fabrication techniques);
C5150 (Other circuits for digital computers); C5420
(Mainframes and minicomputers)",
classification = "B0170J (Product packaging); B0540 (Ceramics and
refractories); B2130 (Capacitors); B2220C (General
fabrication techniques); B2220J (Hybrid integrated
circuits); C5150 (Other circuits for digital
computers); C5420 (Mainframes and minicomputers)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "BaTiO$_3$ based dielectric; BaTiO/sub 3/ based;
capacitors; ceramics; circuits; conduction; conduction
modules; cooling; Cu; decoupling capacitors; Decoupling
capacitors; decoupling path; Decoupling path inductance
minimization; dielectric; electron device noise;
fabrication processes; glass ceramic/Cu/polyimide
substrates; Glass ceramic/Cu/polyimide substrates;
heat; hybrid integrated circuits; IBM computers; IBM
Enterprise; IBM Enterprise System/9000 processors;
inductance; inductance design; inductance minimization;
integrated circuit manufacture; integrated logic; logic
circuits; Logic circuits; low-; Low-inductance design;
mainframes; multichip modules; performance;
Performance; semiconductor chips; Semiconductor chips;
substrates; System/9000 processors; thermal; Thermal
conduction modules; thick-film multilayer ceramic;
Thick-film multilayer ceramic fabrication processes;
thin-film termination processes; Thin-film termination
processes; voltage noise; Voltage noise; water cooled
module; Water cooled module",
thesaurus = "Capacitors; Ceramics; Cooling; Electron device noise;
Heat conduction; Hybrid integrated circuits; IBM
computers; Inductance; Integrated circuit manufacture;
Integrated logic circuits; Mainframes; Multichip
modules; Substrates",
treatment = "P Practical",
}
@Article{Boone:1992:AED,
author = "L. E. Boone and M. R. Brinthaupt and J. A. Malack and
J. Pavlik",
title = "Aspects of the electrical design and analyses of the
printed circuit boards of the {IBM Enterprise
System\slash 9000} water-cooled processors",
journal = j-IBM-JRD,
volume = "36",
number = "5",
pages = "943--955",
month = sep,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Aspects of the electrical design and analyses of the
multilayer printed circuit boards of the IBM Enterprise
System/9000 water-cooled processors are discussed. The
design and analyses pertained to achieving an increase
in wirability and a decrease in voltage drops, power
loss, simultaneous switching noise, variation in
characteristic impedance, and reflections due to the
presence of stubs.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210B (Printed circuit layout and design); C5120
(Logic and switching circuits); C5420 (Mainframes and
minicomputers)",
classification = "B2210B (Printed circuit layout and design); C5120
(Logic and switching circuits); C5420 (Mainframes and
minicomputers)",
corpsource = "IBM Technol. Products, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "characteristic; Characteristic impedance; electrical
analyses; Electrical analyses; electrical design;
Electrical design; Enterprise System/9000; IBM; IBM
computers; IBM Enterprise System/9000; impedance; loss;
mainframes; multilayer printed circuit boards;
Multilayer printed circuit boards; power; Power loss;
printed circuit design; processors; reflections;
Reflections; simultaneous switching noise; Simultaneous
switching noise; stubs; Stubs; voltage drops; Voltage
drops; water-cooled; Water-cooled processors;
wirability; Wirability",
thesaurus = "IBM computers; Mainframes; Printed circuit design",
treatment = "P Practical",
}
@Article{Nicholson:1992:CEK,
author = "C. N. Nicholson",
title = "The controlled experiment in knowledge-acquisition
research",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "958--964",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A review is given of the literature about controlled
experiments in research on knowledge acquisition. The
review was carried out to help the author make decision
about the design of his own experiment comparing two
knowledge-acquisition methods. The author looks
critically at six experiments reported in the
literature, and proposes a framework within which such
empirical work can be viewed. He concludes that some of
the apparent difficulties can be resolved, and that
controlled experiments can be a useful way of
discovering the relationships at work in a
knowledge-acquisition project.",
acknowledgement = ack-nhfb,
affiliation = "IBM United Kingdom Lab. Ltd., Winchester, UK",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6170 (Expert systems); C0310 (EDP management)",
classification = "C0310 (EDP management); C6170 (Expert systems)",
corpsource = "IBM United Kingdom Lab. Ltd., Winchester, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Controlled experiments; controlled experiments;
Empirical work; empirical work; experiments;
Experiments; knowledge acquisition; Knowledge
acquisition; research and development management",
thesaurus = "Knowledge acquisition; Research and development
management",
treatment = "P Practical",
}
@Article{Bollinger:1992:KO,
author = "T. Bollinger and U. Pletat",
title = "Knowledge in operation",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "965--989",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The L$_{LILOG}$ knowledge representation language and
an inference engine to interpret it have been developed
as part of the LILOG project, where new concepts for
understanding natural-language texts were investigated.
L$_{LILOG}$ is a typed predicate logic whose type
system has adopted the concepts of KL-One-like
languages. Further language constructs allow the
formulation of default and control knowledge. The
inference engine for L$_{LILOG}$ was designed as an
experimental theorem prover, allowing the authors to
investigate the behavior of various inference calculi
as well as a number of search strategies. Processing
with L$_{LILOG}$ is not restricted to a propositional
reasoner for logical formulas; they are also able to
delegate special kinds of inferences to external
deductive components. Currently, one such external
reasoner for processing spatial information on the
basis of analog representation is attached to the
inference engine.",
acknowledgement = ack-nhfb,
affiliation = "IBM Germany, GSDL Software Architectures and Technol.,
Boeblingen, Germany",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6170 (Expert systems); C6140D (High level languages);
C6180N (Natural language processing); C4210 (Formal
logic); C6110L (Logic programming)",
classification = "C4210 (Formal logic); C6110L (Logic programming);
C6140D (High level languages); C6170 (Expert systems);
C6180N (Natural language processing)",
corpsource = "IBM Germany, GSDL Software Architectures and Technol.,
Boeblingen, Germany",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analog representation; analog representation; control
knowledge; Control knowledge; engine; experimental
theorem; Experimental theorem prover; external
deductive components; External deductive components;
formal logic; inference; Inference calculi; inference
calculi; Inference engine; inference mechanisms;
KL-One-like languages; knowledge; L$_{LILOG}$ knowledge
representation language; L/sub LILOG/ knowledge
representation language; language constructs; Language
constructs; languages; LILOG project; logic programming
languages; Logical formulas; logical formulas; natural;
Natural-language texts; natural-language texts;
predicate logic; propositional; Propositional reasoner;
prover; reasoner; representation; search strategies;
Search strategies; spatial information; Spatial
information; theorem proving; type system; Type system;
typed; Typed predicate logic",
thesaurus = "Formal logic; Inference mechanisms; Knowledge
representation; Logic programming languages; Natural
languages; Theorem proving",
treatment = "B Bibliography; P Practical",
}
@Article{Kumar:1992:UDC,
author = "M. Kumar",
title = "Unique design concepts in {GF11} and their impact on
performance",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "990--1000",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "GF11 is a 512-way SIMD parallel computer currently
used to verify quantum chromodynamics theory and to
explore the SIMD approach to parallel processing.
System design choices, such as network design,
processing element design, and other architectural
features, allow GF11 to sustain very high performance,
close to the 10-gigaFLOPS peak. Several applications,
such as structural analysis, seismic modeling,
computational fluid dynamics, and linear algebra, have
been ported to GF11. Applications execute in the range
of 4 to 10 gigaFLOPS. The diversity in applications
that perform well on GF11 demonstrates that the SIMD
architecture is effective for a much larger set of
applications than previously believed. The high network
and data-memory bandwidths minimize the effort required
to tune applications for optimum performance.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C5220P
(Parallel architecture); C7320 (Physics and
Chemistry)",
classification = "C5220P (Parallel architecture); C5440
(Multiprocessor systems and techniques); C7320 (Physics
and Chemistry)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "4 to 10 GFLOPS; 4 To 10 GFLOPS; 512-way SIMD parallel
computer; 512-Way SIMD parallel computer; architectural
features; Architectural features; computational fluid
dynamics; Computational fluid dynamics; data-;
Data-memory bandwidths; GF11; linear algebra; Linear
algebra; memory bandwidths; modeling; network design;
Network design; parallel architectures; parallel
machines; parallel processing; Parallel processing;
physics computing; processing element design;
Processing element design; quantum chromodynamics;
Quantum chromodynamics theory; seismic; Seismic
modeling; SIMD approach; structural analysis;
Structural analysis; theory; very high performance;
Very high performance",
numericalindex = "Computer speed 4.0E+09 to 1.0E+10 FLOPS",
thesaurus = "Parallel architectures; Parallel machines; Physics
computing",
treatment = "P Practical",
}
@Article{Bahr:1992:ADP,
author = "J. E. Bahr and S. B. Levenstein and L. A. McMahon and
T. J. Mullins and A. H. Wottreng",
title = "Architecture, design, and performance of {Application
System\slash 400} ({AS}\slash 400) multiprocessors",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "1001--1014",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The architecture, design, and performance of
multiprocessors in the Application System/400 (AS/400)
family are discussed. The authors describe how this
multitasking system, originally designed as a
uniprocessor system, was modified to form a
multiprocessor system. The unique approach, using
relatively atomic instructions, required a minimum of
change while providing significant performance gains.",
acknowledgement = ack-nhfb,
affiliation = "IBM Application Business Systems, Rochester, MN, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5440 (Multiprocessor systems and techniques); C6150N
(Distributed systems); C5220P (Parallel architecture);
C6110P (Parallel programming)",
classification = "C5220P (Parallel architecture); C5440
(Multiprocessor systems and techniques); C6110P
(Parallel programming); C6150N (Distributed systems)",
corpsource = "IBM Application Business Systems, Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Application System/400; AS/400; multiprocessor system;
Multiprocessor system; multitasking system;
Multitasking system; parallel; parallel architectures;
parallel machines; performance gains; Performance
gains; programming; relatively atomic instructions;
Relatively atomic instructions",
thesaurus = "Parallel architectures; Parallel machines; Parallel
programming",
treatment = "P Practical; R Product Review",
}
@Article{Anonymous:1992:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "1015--1037",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:01:22 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1992:RIPd,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "1038--1042",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:02:14 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1992:AIP,
author = "Anonymous",
title = "Author index for papers in Volume 36",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "1043--1047",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:03:06 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1992:SIP,
author = "Anonymous",
title = "Subject index for papers in Volume 36",
journal = j-IBM-JRD,
volume = "36",
number = "6",
pages = "1048--1052",
month = nov,
year = "1992",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:03:52 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ono:1993:APE,
author = "H. Ono",
title = "Architecture and performance of the {ESPER-2}
hard-disk drive servo writer",
journal = j-IBM-JRD,
volume = "37",
number = "1",
pages = "3--11",
month = jan,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The servo writer is known as the most accurate and
sensitive tool on an HDD (hard-disk drive)
manufacturing line. ESPER-2 is designed as a
product-independent common servo writer which
incorporates major advances in equipment cost,
reduction of clean-room requirements, and writing
accuracy. The servo writing process consists of two
stages. The first stage writes the master servo pattern
on as many as ten disks at once with little need for
contaminant protection facilities. One such master disk
is then assembled with other, raw, disks in a file, and
the second stage writes the proper servo pattern on all
disk surfaces by referring to the master. The effects
of off-center discursions in the mechanical disk
assembly and random runout (NRRO, or nonrepeatable
runout) in the product spindle components are
eliminated by table-lookup servo actuator control, so
that writing accuracy is improved. Neither an
exceptionally clean environment nor fine mechanical
parts are required for the second-stage operation.",
acknowledgement = ack-nhfb,
affiliation = "Japan Display Technol. Lab., IBM, Kanagawa, Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C0300
(Management topics)",
classification = "C0300 (Management topics); C5320C (Storage on moving
magnetic media)",
corpsource = "Japan Display Technol. Lab., IBM, Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "control; disk assembly; DP industry; ESPER-2; hard
discs; hard-disk drive; Hard-disk drive; hard-disk
drive servo writer; Hard-disk drive servo writer;
manufacturing processes; mechanical; Mechanical disk
assembly; off-center discursions; Off-center
discursions; random runout; Random runout; servo
writing process; Servo writing process; table-lookup
servo actuator; Table-lookup servo actuator control;
writing accuracy; Writing accuracy",
thesaurus = "DP industry; Hard discs; Manufacturing processes",
treatment = "P Practical",
}
@Article{Phillips:1993:PCH,
author = "J. E. Phillips and S. Vassiliadis",
title = "Proof of correctness of high-performance {3-1}
interlock collapsing {ALUs}",
journal = j-IBM-JRD,
volume = "37",
number = "1",
pages = "12--21",
month = jan,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A 32-bit 3-1 interlock collapsing ALU, proposed to
allow the execution of two interlocked ALU-type
instructions in one machine cycle using an
instruction-level parallel machine implementation, is
shown to produce results equivalent to a serial
execution of the instructions using a 2-1 ALU. The
equivalence is shown by deriving tables which represent
all possible requirements for the serial execution of
the instructions followed by the generalization of the
table to represent sets of instructions rather than the
individual instructions themselves. Consequently, the
equivalence of the 3-1 interlock collapsing ALU
operations with these generalized requirements of the
serial execution of the instructions is shown. The
correctness of a proposed high-speed interlock
collapsing ALU is thereby demonstrated.",
acknowledgement = ack-nhfb,
affiliation = "Adv. Workstation Syst., IBM, Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220P (Parallel architecture); C5210 (Logic design
methods); C4210 (Formal logic)",
classification = "C4210 (Formal logic); C5210 (Logic design methods);
C5220P (Parallel architecture)",
corpsource = "Adv. Workstation Syst., IBM, Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3-1 Interlock collapsing ALU; 3-1 interlock collapsing
ALU; ALU operations; Correctness; correctness;
Equivalence; equivalence; logic design; parallel
architectures; parallel machine; Parallel machine",
thesaurus = "Logic design; Parallel architectures",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Deutsch:1993:ECP,
author = "A. Deutsch and D. W. Dranchak and G. Arjavalingam and
C. W. Surovic and J. K. Tam and G. V. Kopcsay and J. B.
Gillett",
title = "Electrical characterization and performance limits of
a flexible cable",
journal = j-IBM-JRD,
volume = "37",
number = "1",
pages = "22--38",
month = jan,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The electrical performance of a flexible-cable test
structure is characterized from low frequencies up to
25 GHz. The experimental results are used to develop
and refine models which describe the performance of
such cables, with particular emphasis on the
contribution of dielectric and resistive losses,
including skin effect. The capability of triplate
flexible cables to provide high-bandwidth connections
over long lengths is investigated with the models
developed. A triplate design is chosen because it
offers high density, limited crosstalk, no loss through
radiation, and relatively inexpensive fabrication. Bit
rates of 100 Mb/s-1 Gb/s are considered for propagation
over lengths up to 250 cm. The paper highlights the
performance-limiting factors through realistic
examples, including the contribution of interfaces to
other interconnection structures.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2160 (Wires and cables); B1310 (Waveguides); B2210F
(Printed circuit accessories)",
classification = "B1310 (Waveguides); B2160 (Wires and cables); B2210F
(Printed circuit accessories)",
corpsource = "Res. Div., IBM Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.1 to 25; 0.1 To 25 GHz; 100 Mbit/s to 1 Gbit/s; 250
cm; 250 Cm; attenuation coefficient; Attenuation
coefficient; cable testing; crosstalk; Crosstalk;
design; dielectric losses; Dielectric losses;
electrical performance; Electrical performance;
electronic interconnection; Electronic interconnection;
flexible cable; Flexible cable; GHz; high-bandwidth
connections; High-bandwidth connections; interface
contribution; Interface contribution; lines; losses;
microstrip; models; Models; performance-limiting
factors; Performance-limiting factors; phase constant;
Phase constant; printed circuit accessories;
propagation length; Propagation length; resistive;
Resistive losses; shielded microstrip configuration;
Shielded microstrip configuration; skin effect; Skin
effect; triplate; Triplate design",
numericalindex = "Frequency 1.0E+08 to 2.5E+10 Hz; Bit rate 1.0E+08 to
1.0E+09 bit/s; Distance 2.5E+00 m",
thesaurus = "Cable testing; Crosstalk; Dielectric losses;
Microstrip lines; Printed circuit accessories; Skin
effect",
treatment = "X Experimental",
}
@Article{Horkans:1993:PES,
author = "J. Horkans",
title = "Preface: Electrochemical Science and Technology",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "83--84",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Deligianni:1993:SSP,
author = "H. Deligianni and L. T. Romankiw",
title = "In situ surface {pH} measurement during electrolysis
using a rotating {pH} electrode",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "85--95",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An in situ technique has been developed for measuring
the surface pH adjacent to a solid electrode/liquid
interface during electrolysis. Measurements of the
surface pH of a solution containing simple salts during
hydrogen evolution from a cathode were performed. The
surface pH of a cathode during Ni and NiFe
electrodeposition was also measured. The experiments
demonstrated that, in the absence of buffers or metal
ions, the surface pH rises many pH units above the bulk
value. During Ni and NiFe electrodeposition, however,
the surface pH of solutions consisting of simple salts
and starting from a bulk pH level of 2 does not
increase more than 3 pH units from the bulk value.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Ni/el; NiFe/bin Fe/bin Ni/bin",
classcodes = "A8280F (Electrochemical methods); A8245
(Electrochemistry and electrophoresis); A8115L
(Deposition from liquid phases (melts and solutions));
A8160 (Corrosion, oxidation, etching, and other surface
treatments); B0520 (Thin film growth); B7320T (Chemical
variables)",
classification = "A8115L (Deposition from liquid phases (melts and
solutions)); A8160 (Corrosion, oxidation, etching, and
other surface treatments); A8245 (Electrochemistry and
electrophoresis); A8280F (Electrochemical methods);
B0520 (Thin film growth); B7320T (Chemical variables)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Dahms-Croll; Dahms-Croll hypothesis; electrode;
electrode/liquid interface; Electrode/liquid interface;
electrodeposition; Electrodeposition; electrolysis;
Electrolysis; hypothesis; in situ technique; In situ
technique; localised measurement; Localised
measurement; metal-ion hydrolysed; Metal-ion hydrolysed
species; Ni deposition; NiFe deposition; pH
measurement; rotating pH; Rotating pH electrode;
species; surface buffering; Surface buffering; surface
chemistry; surface pH measurement; Surface pH
measurement; transition metal deposition; Transition
metal deposition",
thesaurus = "Electrodeposition; PH measurement; Surface chemistry",
treatment = "X Experimental",
}
@Article{Horkans:1993:RRS,
author = "J. Horkans and I. C. {Hsu Chang} and P. C.
Andricacos",
title = "A rotating ring-disk stripping technique used to study
electroplating of {Sn-Pb} from methane sulfonic acid
solutions",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "97--106",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A rotating ring-disk stripping technique has been used
to analyze Sn-Pb alloys plated from methane sulfonic
acid solutions with and without a proprietary additive
and to construct associated current-potential curves.
The deposition of both pure Sn and pure Pb was
polarized by the additive, but the polarization was
much greater for Pb. For alloys plated without the
additive, the potential dependence of the partial
currents i$_{Sn}$ and i$_{Pb}$ was essentially the same
as that of the pure metals. The alloy compositions were
very different from the solution ratios Sn(II):Pb(II)
and could be either tin-rich or lead-rich compared to
the solution. In the presence of the additive, on the
other hand, the alloy compositions approximated the
solution compositions of the metal ions. The
electrodissolution of Sn-Pb alloys in HCl shows a
complex oscillatory behaviour, which is produced by the
selective dissolution of Sn but which may also be
sustained by the formation and redissolution of
sparingly soluble surface films.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "SnPb/bin Pb/bin Sn/bin",
classcodes = "A8280F (Electrochemical methods); A8245
(Electrochemistry and electrophoresis); A8160
(Corrosion, oxidation, etching, and other surface
treatments); A8115L (Deposition from liquid phases
(melts and solutions)); B0520 (Thin film growth);
B7320T (Chemical variables)",
classification = "A8115L (Deposition from liquid phases (melts and
solutions)); A8160 (Corrosion, oxidation, etching, and
other surface treatments); A8245 (Electrochemistry and
electrophoresis); A8280F (Electrochemical methods);
B0520 (Thin film growth); B7320T (Chemical variables)",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "(chemical analysis); complex oscillatory behaviour;
Complex oscillatory behaviour; current-potential
curves; Current-potential curves; dissolution;
electrodissolution; Electrodissolution; electroplating;
Electroplating; lead alloys; methane sulfonic acid
solutions; Methane sulfonic acid solutions; partial
currents; Partial currents; polarization; Polarization;
potential dependence; Potential dependence; ring-disk
stripping technique; rotating; Rotating ring-disk
stripping technique; selective; Selective dissolution;
Sn-Pb; tin alloys; voltammetry",
thesaurus = "Electroplating; Lead alloys; Tin alloys; Voltammetry
[chemical analysis]",
treatment = "X Experimental",
}
@Article{Gaudiello:1993:MIM,
author = "J. G. Gaudiello and G. L. Ballard",
title = "Mechanistic insights into metal-mediated electroless
copper plating employing hypophosphite as a reducing
agent",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "107--115",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Electroless copper plating using systems containing a
small amount of Ni/sup 2+/ or Pd/sup 2+/ as a mediator
and hypophosphite as a reducing agent was investigated
using several electrochemical techniques. Isothermal
and component-dependent polarization, rate E$_{mix}$,
split-cell, and AC impedance data suggested that the
systems obey mixed potential theory and function as
follows: (a) the mediator is initially deposited from
solution to the surface of the workpiece via
hypophosphite reduction, (b) oxidation of the
hypophosphite at mediator sites supplies charge for Cu
reduction, and (c) Cu plating occurs over the entire
workpiece, XPS analysis and depth profiling of the
resulting deposits suggested that they are homogeneous
in nature and that the mediator is uniformly
distributed throughout.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/el",
classcodes = "B0520 (Thin film growth); B2550F (Metallisation);
B0170J (Product packaging)",
classification = "B0170J (Product packaging); B0520 (Thin film
growth); B2550F (Metallisation)",
corpsource = "IBM Technol. Products, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AC; AC impedance; component-dependent polarization;
Component-dependent polarization; copper; depth; Depth
profiling; electrochemical split-cell studies;
Electrochemical split-cell studies; electroless Cu
plating; Electroless Cu plating; electroless
deposition; hypophosphite; Hypophosphite; impedance;
interconnects; Interconnects; metal-mediated plating;
Metal-mediated plating; metallisation; mixed potential
theory; Mixed potential theory; packaging; Packaging;
profiling; reducing agent; Reducing agent; voltammetry;
Voltammetry; voltammetry (chemical analysis); X-ray
photoelectron spectra; XPS analysis",
thesaurus = "Copper; Electroless deposition; Metallisation;
Packaging; Voltammetry [chemical analysis]; X-ray
photoelectron spectra",
treatment = "P Practical; X Experimental",
}
@Article{Jagannathan:1993:EPC,
author = "R. Jagannathan and M. Krishnan",
title = "Electroless plating of copper at a low {pH} level",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "117--123",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A new process for electroless copper plating at a pH
level of <or=9 is described. The process uses amine
borane reducing agents and ligands based on neutral
tetradentate nitrogen donors. The use of a variety of
buffer systems is demonstrated. Electroless bath
performance over a wide range of conditions is
presented. The quality of the plated copper is
comparable to that obtained by currently used
electroless plating processes, and has a resistivity of
about 1.8-2$\mu\Omega$ -cm, depending on bath
composition and process parameters. Use of the process
is illustrated for forming conductors and filling via
holes having submicron minimum dimensions.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/el",
classcodes = "B0520 (Thin film growth); B2550F (Metallisation);
B0170J (Product packaging)",
classification = "B0170J (Product packaging); B0520 (Thin film
growth); B2550F (Metallisation)",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "amine borane; Amine borane reducing agents; Bath
performance; bath performance; buffer systems; Buffer
systems; Conductors; conductors; copper; Cu plating;
electroless deposition; electroless plating;
Electroless plating; filling via; Filling via holes;
holes; low pH level; Low pH level; metallisation;
Neutral tetradentate nitrogen donors; neutral
tetradentate nitrogen donors; packaging; Packaging;
packaging; reducing agents; submicron minimum
dimensions; Submicron minimum dimensions",
thesaurus = "Copper; Electroless deposition; Metallisation;
Packaging",
treatment = "P Practical; X Experimental",
}
@Article{Dukovic:1993:FSR,
author = "J. O. Dukovic",
title = "Feature-scale simulation of resist-patterned
electrodeposition",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "125--141",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A numerical simulation of resist-patterned or
`through-mask' electroplating has been performed to
investigate shape evolution at the scale of small
lithographic features. Shape evolution and step
coverage have a significant influence on the shapes of
such microelectronic structures as conductor lines,
vias, and magnetic pole pieces. The simulation and
associated analysis are based on a model for the rate
distribution of the electrodeposition reaction that
includes the depletion of the depositing metal ions and
the inhibiting action of levelling agents. A stagnant
boundary layer is assumed to be present, and the
diffusion theory of levelling with a one-parameter
description of kinetic inhibition is employed. The
results show that when the geometry of a feature cavity
makes possible the occurrence of concentration-field
effects, an uneven metal-ion flux should cause
nonuniform growth at high fractions of the limiting
current.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520 (Thin film growth); B2550F (Metallisation);
B2550G (Lithography); B0170J (Product packaging)",
classification = "B0170J (Product packaging); B0520 (Thin film
growth); B2550F (Metallisation); B2550G (Lithography)",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "concentration-field; Concentration-field effects;
conductor lines; Conductor lines; description;
distribution; effects; electroplating; feature-scale
simulation; Feature-scale simulation; kinetic
inhibition; Kinetic inhibition; magnetic pole pieces;
Magnetic pole pieces; metallisation; model; Model;
nonuniform growth; Nonuniform growth; numerical
simulation; Numerical simulation; one-parameter;
One-parameter description; packaging; rate; Rate
distribution; resist-patterned electrodeposition;
Resist-patterned electrodeposition; resists;
semiconductor process modelling; shape evolution; Shape
evolution; small lithographic features; Small
lithographic features; stagnant boundary layer;
Stagnant boundary layer; step coverage; Step coverage;
through-mask electroplating; Through-mask
electroplating; uneven metal-ion flux; Uneven metal-ion
flux; vias; Vias",
thesaurus = "Electroplating; Metallisation; Packaging; Resists;
Semiconductor process modelling",
treatment = "T Theoretical or Mathematical",
}
@Article{Moreno:1993:MTI,
author = "O. A. Moreno and R. H. Katyl and J. D. Jones and P. A.
Moschak",
title = "Mass transfer of an impinging jet confined between
parallel plates (Jet array processing)",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "143--155",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An understanding of the mass transfer behaviour of an
impinging jet can be usefully applied to wet chemical
processes such as water rinsing, photoresist
development, and metal etching or plating. Theoretical
and experimental methods were used to study the mass
transfer characteristics of an axisymmetric impinging
jet confined between two parallel plates. Such a
configuration was used because of its potential
applicability to the fabrication of printed wiring
boards. The CFD (computation fluid dynamics) method was
used to model fluid flow and mass transfer. An
electrochemical probe based on the ferro-ferricyanide
system was used to experimentally determine the mass
transfer coefficients and to evaluate the applicability
of the theoretical methods used. An etching method was
used to characterize the mass transfer rates in a
typical cupric chloride etching solution. A new
observation of the effect of jet instability on the
etching rate in the central impingement zone is
discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture); B0170E
(Production facilities and engineering); B0520 (Thin
film growth)",
classification = "B0170E (Production facilities and engineering);
B0520 (Thin film growth); B2210D (Printed circuit
manufacture)",
corpsource = "IBM Technol. Products, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "axisymmetric impinging jet; Axisymmetric impinging
jet; boards; central impingement zone; Central
impingement zone; computation fluid dynamics;
Computation fluid dynamics; effect of jet; Effect of
jet instability; electrochemical probe; Electrochemical
probe; electroplating; etching; etching method; Etching
method; etching rate; Etching rate; fabrication;
Fabrication; ferro-ferricyanide system;
Ferro-ferricyanide system; instability; jet array
processing devices; Jet array processing devices; jets;
mass transfer; mass transfer behaviour; Mass transfer
behaviour; modelling; parallel plates confined;
Parallel plates confined; photoresist development;
Photoresist development; photoresists; printed circuit
manufacture; printed wiring; Printed wiring boards;
rinsing; Rinsing; surface treatment",
thesaurus = "Electroplating; Etching; Jets; Mass transfer;
Modelling; Photoresists; Printed circuit manufacture;
Surface treatment",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Kanazawa:1993:QRE,
author = "K. K. Kanazawa and O. R. Melroy",
title = "The quartz resonator: Electrochemical applications",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "157--171",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The principles of operation are detailed, with
emphasis on an intuitive description to permit
considerations of new applications. Mass density
changes of the order of 10 nanograms per square
centimeter (ng/cm/sup 2/) are routinely detectable as
changes in the resonant frequency of about a hertz. The
mass density of a monolayer of material ranges from a
few tens of ng/cm/sup 2/ for polymeric materials to a
few hundreds of ng/cm/sup 2/ for metals. Detailed
analysis of the electrical behaviour of the resonator
in liquid media shows that the resonant frequency, the
quality factor of the resonance, and the admittance at
resonance are all sensitive to the viscoelastic
properties of the contacting liquid, having
implications in the study of the behavior of
non-Newtonian fluids, including polymeric films.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "SiO2/sur O2/sur Si/sur O/sur SiO2/bin O2/bin Si/bin
O/bin",
classcodes = "A0630E (Mass and density measurement); A0130R (Reviews
and tutorial papers; resource letters); A8245
(Electrochemistry and electrophoresis); B7320M (Mass
and density); B2860 (Piezoelectric and ferroelectric
devices)",
classification = "A0130R (Reviews and tutorial papers; A0630E (Mass
and density measurement); A8245 (Electrochemistry and
electrophoresis); B2860 (Piezoelectric and
ferroelectric devices); B7320M (Mass and density);
resource letters)",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Admittance at resonance; admittance at resonance;
crystal resonators; electrical behaviour; Electrical
behaviour; electrochemical; Electrochemical
applications; electrochemical applications;
Electrochemical interface; electrochemistry; Film
deposition monitor; film deposition monitor; interface;
liquid media; Liquid media; mass density; Mass density;
mass measurement; metals; Metals; microbalance;
Microbalance; Monolayer; monolayer; Non-Newtonian
fluids; non-Newtonian fluids; polymeric materials;
Polymeric materials; properties; quality factor;
Quality factor; quartz resonator; Quartz resonator;
Resonant frequency; resonant frequency; reviews;
SiO$_2$; viscoelastic; Viscoelastic properties",
thesaurus = "Crystal resonators; Electrochemistry; Mass
measurement; Reviews",
treatment = "B Bibliography; G General Review",
}
@Article{Brusic:1993:CPT,
author = "V. Brusic and G. S. Frankel and C.-K. Hu and M. M.
Plechaty and G. C. Schwartz",
title = "Corrosion and protection of thin-line conductors in
{VLSI} structures",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "173--189",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Thin metallic lines in VLSI circuit structures are
usually encapsulated in a dielectric in order to
protect them from the atmosphere and prevent corrosion.
However, during processing the lines are unprotected.
The authors' work pertains to the loss which is due to
corrosion during processing. The focus on the corrosion
behavior of the two of the most commonly used
conductors, aluminum and copper. Aluminum alloyed with
small amounts of copper is also considered. The
corrosion-related behaviors of aluminum and copper are
vastly different, as is shown by their reaction with
water and several processing solutions. The challenge
of minimizing corrosion during processing as well as
during subsequent storage and use is discussed, using
suitable examples drawn from studies of thin films of
the metals exposed to chemical etching, reactive ion
etching, and cleaning.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Al/sur Al/el; AlCu/sur Al/sur Cu/sur AlCu/ss Al/ss
Cu/ss; Cu/sur Cu/el",
classcodes = "B2550F (Metallisation); B2570 (Semiconductor
integrated circuits)",
classification = "B2550F (Metallisation); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Al films; Al-Cu; conductors; corrosion; Corrosion;
corrosion protection; Cu films; etching effects;
Etching effects; Interconnections; interconnections;
metallisation; processing; Processing solutions;
Protection; protection; solutions; thin-line; Thin-line
conductors; VLSI; VLSI structures",
thesaurus = "Corrosion; Corrosion protection; Metallisation; VLSI",
treatment = "G General Review; P Practical",
}
@Article{Schrott:1993:AXS,
author = "A. G. Schrott and G. S. Frankel",
title = "Application of {X-ray} spectroscopy to the study of
electrochemically formed surface oxide films",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "191--206",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors discuss X-ray photoelectron spectroscopy
(XPS) and X-ray absorption spectroscopy (XAS), and
their application to the study of electrochemically
formed oxide films. A brief review of the phenomena
underlying these techniques is provided, along with a
description of the commonly used means for implementing
them. Their capabilities and limitations are discussed,
with an emphasis on the study of passive film
composition and oxidation state. A summary of the
behavior of Cr in oxide films on Al-Cr alloys is
presented as an example. The coordinated use of both
XPS and XAS is shown to be useful in achieving full
understanding of materials systems such as
electrochemically formed oxide films.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "AlCr sur Al/sur Cr/sur AlCr/ss Al/ss Cr/ss",
classcodes = "A8280D (Electromagnetic radiation spectrometry);
A8160B (Metals and alloys); A8280P (Electron
spectroscopy for chemical analysis (photoelectron,
Auger spectroscopy, etc.)); A7960 (Photoemission and
photoelectron spectra); A0785 (X-ray, gamma-ray
instruments and techniques)",
classification = "A0785 (X-ray, gamma-ray instruments and techniques);
A7960 (Photoemission and photoelectron spectra); A8160B
(Metals and alloys); A8280D (Electromagnetic radiation
spectrometry); A8280P (Electron spectroscopy for
chemical analysis (photoelectron, Auger spectroscopy,
etc.))",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Al-; Al-Cr alloys; chemical analysis; Chemical
analysis; Cr alloys; electrochemically formed;
Electrochemically formed; films; oxidation; oxidation
state; Oxidation state; passivation; passive film
composition; Passive film composition; spectroscopy;
surface oxide; Surface oxide films; X-ray; X-ray
absorption; X-ray absorption spectra; X-ray absorption
spectroscopy; X-ray photoelectron spectra; X-ray
photoelectron spectroscopy",
thesaurus = "Oxidation; Passivation; X-ray absorption spectra;
X-ray chemical analysis; X-ray photoelectron spectra;
X-ray spectroscopy",
treatment = "A Application; G General Review",
}
@Article{Datta:1993:ADM,
author = "M. Datta",
title = "Anodic dissolution of metals at high rates",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "207--226",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Electrochemical metal shaping and finishing processes
involve anodic dissolution of metals at high rates. The
author presents a review of some fundamental aspects
related to the understanding of such processes.
Included are discussions of the phenomena of passive
film breakdown that lead to the transpassive
dissolution of metals, some of the available
information on anodic reaction stoichiometry, and the
role of convective mass transport and salt
precipitation layers on metal removal rate and surface
finish. The use of pulsating current permits the
altering of anodic mass transport rates and
transpassive dissolution behavior, thereby making it
possible to obtain high dissolution efficiencies even
at low average current densities.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8160B (Metals and alloys); A0130R (Reviews and
tutorial papers; resource letters); A8245
(Electrochemistry and electrophoresis); B8620
(Manufacturing industries); B0170G (General fabrication
techniques)",
classification = "A0130R (Reviews and tutorial papers; A8160B (Metals
and alloys); A8245 (Electrochemistry and
electrophoresis); B0170G (General fabrication
techniques); B8620 (Manufacturing industries); resource
letters)",
corpsource = "IBM Res. Div., Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Anodic dissolution; anodic dissolution; anodic mass;
Anodic mass transport rates; anodic reaction
stoichiometry; Anodic reaction stoichiometry;
convective mass transport; Convective mass transport;
dissolving; electrochemical; Electrochemical machining;
electrolytic machining; electrolytic polishing;
Electropolishing; electropolishing; high rates; High
rates; machining; metal; Metal removal rate; metals;
Metals; Passive film breakdown; passive film breakdown;
pulsating current; Pulsating current; removal rate;
reviews; Salt precipitation layers; salt precipitation
layers; Surface finish; surface finish; Transpassive
dissolution; transpassive dissolution; transport
rates",
thesaurus = "Dissolving; Electrolytic machining; Electrolytic
polishing; Reviews",
treatment = "B Bibliography; G General Review",
}
@Article{Seki:1993:SIS,
author = "H. Seki",
title = "In situ infrared spectroscopy of the
electrode-electrolyte interface",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "227--241",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Fourier transform infrared reflection absorption
spectroscopy has seen rapid progress and is in wide
use. A review of the techniques used in the author's
laboratory and examples of recent measurements are
presented. The adsorbed species discussed are CO,
CN/sup -/, SO$_4$/sup 2-/, and HSO$_4$/sup -/, and the
electrodes are, in most cases, polycrystalline noble
metals. It is shown how the interpretation of the
infrared spectra is greatly aided by comparison with ab
initio molecular orbital computations of ions and
molecules on metal clusters. Some of the difficulties
in the interpretation of the infrared spectra are
illustrated, and the future development of optical
vibrational spectroscopy for studying
electrode-electrolyte interfaces is discussed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "CO/ads C/ads O/ads CO/bin C/bin O/bin; CN/ads C/ads
N/ads CN/bin C/bin N/bin; SO4/ads O4/ads O/ads S/ads
SO4/bin O4/bin O/bin S/bin; HSO4/ads SO4/ads O4/ads
H/ads O/ads S/ads HSO4/ss SO4/ss O4/ss H/ss O/ss S/ss",
classcodes = "A8280D (Electromagnetic radiation spectrometry);
A0130R (Reviews and tutorial papers; resource letters);
A8245 (Electrochemistry and electrophoresis); A0765G
(IR spectroscopy and spectrometers)",
classification = "A0130R (Reviews and tutorial papers; A0765G (IR
spectroscopy and spectrometers); A8245
(Electrochemistry and electrophoresis); A8280D
(Electromagnetic radiation spectrometry); resource
letters)",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ab initio molecular orbital; Ab initio molecular
orbital computations; adsorbed species; Adsorbed
species; analysis; CN$^-$; CO; computations;
electrochemistry; electrode-electrolyte interfaces;
Electrode-electrolyte interfaces; Fourier transform
infrared; Fourier transform infrared reflection
absorption spectroscopy; Fourier transform
spectroscopy; HSO$_4^-$; in situ IR spectroscopy; In
situ IR spectroscopy; infrared; interface phenomena;
metal clusters; Metal clusters; optical vibrational;
Optical vibrational spectroscopy; polycrystalline noble
metals; Polycrystalline noble metals; reflection
absorption spectroscopy; reviews; SO$_4^{2-}$;
SO$_^{2-}$; spectrochemical; spectroscopy",
thesaurus = "Electrochemistry; Fourier transform spectroscopy;
Infrared spectroscopy; Interface phenomena; Reviews;
Spectrochemical analysis",
treatment = "B Bibliography; G General Review",
}
@Article{White:1993:CMC,
author = "J. R. White",
title = "Conduction mechanisms in contaminant layers on printed
circuit boards",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "243--248",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "AC impedance methods have been utilized to explore
surface conduction mechanisms on printed circuit boards
(PCBs) containing various types of solder flux
contaminants. Residues from water-soluble, rosin-based,
and no-clean fluxes were analyzed and evaluated for
their potential impact on reliability. Impedance data
for intentionally contaminated PCBs having several
circuit line geometries were obtained at different
relative humidities. An equivalent circuit model is
presented that fits the data obtained. It is used to
evaluate and distinguish among ohmic, kinetic, and
diffusion effects and to predict the environmental
conditions that may be detrimental for various line
geometries.",
acknowledgement = ack-nhfb,
affiliation = "3M Electron. Products Div., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture)",
classification = "B2210D (Printed circuit manufacture)",
corpsource = "3M Electron. Products Div., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AC impedance; AC impedance methods; contaminant
layers; Contaminant layers; contaminants; diffusion
effects; Diffusion effects; electric impedance;
electrochemical parameters; Electrochemical parameters;
environmental conditions; Environmental conditions;
equivalent circuit model; Equivalent circuit model;
equivalent circuits; kinetic effect; Kinetic effect;
manufacture; methods; ohmic effects; Ohmic effects;
printed circuit; printed circuit boards; Printed
circuit boards; reliability; Reliability; solder flux;
Solder flux contaminants; soldering; surface conduction
mechanisms; Surface conduction mechanisms",
thesaurus = "Electric impedance; Equivalent circuits; Printed
circuit manufacture; Soldering",
treatment = "X Experimental",
}
@Article{Diaz:1993:CCO,
author = "A. F. Diaz and J. Guay",
title = "Contact charging of organic materials: Ion vs.
electron transfer",
journal = j-IBM-JRD,
volume = "37",
number = "2",
pages = "249--259",
month = mar,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The authors describe some of the recent literature on
the contact charging (tribocharging and contact
electrification) of organic materials. It has been
proposed that the charging is due to the transfer of
electrons and/or ions. In some studies, the correlation
between the charging and the substituent constants for
a substituted series of compounds has been used to
support the electron transfer mechanism, and it has
been proposed that the correlation reflects systematic
changes in the energy levels of the highest and lowest
occupied molecular orbitals of the derivatives. In
others, the detection of the ions that are transferred
during contact and the correspondence between their
sign and that of the transferred charge have been used
to support the ion transfer mechanism. The authors
discuss a selected number of papers that relate the
charging behavior to electrochemistry and discuss the
results reported in light of the two transfer
mechanisms.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A7340B (Static electrification); A0130R (Reviews and
tutorial papers; resource letters); A8245
(Electrochemistry and electrophoresis); A4110D
(Electrostatics, magnetostatics)B5110
(Electrostatics)",
classification = "A0130R (Reviews and tutorial papers; A4110D
(Electrostatics, magnetostatics); A7340B (Static
electrification); A8245 (Electrochemistry and
electrophoresis); B5110 (Electrostatics); resource
letters)",
corpsource = "IBM Res. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "contact charging; Contact charging; contact
electrification; Contact electrification;
electrification; electrochemistry; Electrochemistry;
electron transfer; Electron transfer; ion transfer; Ion
transfer; organic compounds; organic materials; Organic
materials; reviews; static; transfer mechanisms;
Transfer mechanisms; tribocharging; Tribocharging",
thesaurus = "Electrochemistry; Organic compounds; Reviews; Static
electrification",
treatment = "B Bibliography; G General Review",
}
@Article{Warlaumont:1993:PXR,
author = "John M. Warlaumont",
title = "Preface: {X}-Ray Lithography",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "288--289",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Spiller:1993:EHX,
author = "E. Spiller",
title = "Early history of {X}-ray lithography at {IBM}",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "291--297",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The author presents a reconstruction of the early work
on X-ray lithography at the IBM East Fishkill facility
in 1969 and 1970 and a summary of the efforts at the
Thomas J. Watson Research Center in Yorktown Heights,
New York, between 1973 and 1976.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "B2550G (Lithography); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1969; 1970; 1973 to 1976; 1973 To 1976; early history;
Early history; history; IBM; Thomas J. Watson Research
Center; X-ray lithography",
thesaurus = "History; X-ray lithography",
treatment = "G General Review",
}
@Article{Wilson:1993:XLI,
author = "Alan D. Wilson",
title = "{X-ray} lithography in {IBM}, {1980--1992}, the
development years",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "299--318",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM X-ray lithography research and development
program is outlined, from a personal perspective,
covering the period from the inception of the program
in 1980 through the development of IBM's own storage
ring for X-ray production in 1992. The following
aspects, among others, are discussed: origins of the
program; acquisition of an X-ray port at Brookhaven
National Laboratory; masks for X-ray lithography;
development of special tooling for X-ray lithography,
including a wafer stepper, a precision e-beam X-ray
mask writing system, and a superconducting (dipole)
electron synchrotron installed in the IBM Advanced
Lithography Facility (ALF) in East Fishkill, New York.
Key device programs were conducted to increase
understanding of the X-ray lithography process and
confirm its utility.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B7410D (Particle sources and
targets); B7450 (X-ray and gamma-ray equipment); B2570
(Semiconductor integrated circuits)",
classification = "B2550G (Lithography); B2570 (Semiconductor
integrated circuits); B7410D (Particle sources and
targets); B7450 (X-ray and gamma-ray equipment)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1980 To 1992; 1980 to 1992; electron accelerators;
IBM; lithography; Masks; masks; Precision e-beam X-ray
mask writing system; precision e-beam X-ray mask
writing system; Storage ring; storage ring; storage
rings; superconducting electron synchrotron;
Superconducting electron synchrotron; synchrotrons;
wafer stepper; Wafer stepper; X-ray; X-ray lithography;
X-ray production",
thesaurus = "Electron accelerators; Storage rings; Synchrotrons;
X-ray lithography; X-ray production",
treatment = "G General Review; P Practical",
}
@Article{Smith:1993:XLN,
author = "Henry I. Smith and M. L. Schattenburg",
title = "{X-ray} lithography, from 500 to 30 nm: {X-ray}
nanolithography",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "319--329",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Proximity X-ray lithography (XRL), using wavelengths
between 0.8 and 1.5 nm, provides a near-ideal match to
the `system problem' of lithography for feature sizes
from 500 to 30 nm, by virtue of `absorption without
scattering' and recently developed mask technology. The
effects of photoelectrons, at one time through to be
problematic, are now understood not to limit
resolution. With experiments and simulations via
Maxwell's equations, the author shows that useful
resolution is not limited by diffraction until
linewidths are below 50 nm. It is critically important
to optimize the source spatial incoherence to eliminate
the deleterious effects of high spatial frequencies.
Mask architecture and patterning methods are presented
which he believes are compatible with manufacturing at
linewidths from 500 to 30 nm. Distortion due to mask
frame flexing and absorber stress can now be
eliminated. Elimination of distortion at the pattern
generation stage remains the problem of greatest
concern. He discusses a proposed method of
spatial-phase-locked electron-beam lithography which
could solve this problem. The new interferometric
alignment scheme has achieved 18-nm alignment at 3
sigma. He asserts that projection XRL using multilayer
mirrors at 13 nm can never match the present
performance of proximity XRL. Applications of
sub-100-nm XRL, including MOS, quantum-effect, and
optoelectronic devices are discussed which illustrate
the benefits of high resolution, process robustness,
low distortion, low damage, and high throughput.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. Eng. and Comput. Sci., MIT,
Cambridge, MA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "B2550G (Lithography); B2570 (Semiconductor
integrated circuits)",
corpsource = "Dept. of Electr. Eng. and Comput. Sci., MIT,
Cambridge, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "30; 30 To 500 nm; distortion; Distortion; effect
devices; electron beam lithography; Feature sizes;
feature sizes; interferometric alignment scheme;
Interferometric alignment scheme; mask architecture;
Mask architecture; mask frame flexing; Mask frame
flexing; Mask patterning; mask patterning; Maxwell
equations; Maxwell's equations; MOS devices;
nanolithography; nanotechnology; optoelectronic
devices; Optoelectronic devices; Proximity X-ray
lithography; proximity X-ray lithography; quantum;
Quantum effect devices; Resolution; resolution;
spatial-phase-locked electron-beam lithography;
Spatial-phase-locked electron-beam lithography; to 500
nm; X-ray; X-ray lithography; X-ray nanolithography",
numericalindex = "Size 3.0E-08 to 5.0E-07 m",
thesaurus = "Electron beam lithography; Maxwell equations;
Nanotechnology; X-ray lithography",
treatment = "P Practical; X Experimental",
}
@Article{Guo:1993:MXP,
author = "Jerry Z. Y. Guo and F. Cerrina",
title = "Modeling {X-ray} proximity lithography",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "331--349",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Advanced semiconductor circuits, such as DRAMs, are
based on the very complex fabrication processes.
Because of the cost and complexity involved, it is
rapidly becoming impossible to adopt a
`trial-and-error' approach in the development stage of
a new process. Fortunately, the advances in computer
power spurred by the new semiconductor devices have
made it possible to compute the response of complex
systems in a reasonable time on workstations. Thus, the
study of a virtual representation of the process (that
is, a model) can represent a solution to the high cost
of process development-of course, after verification of
the model accuracy through controlled experiments. A
correct physical interpretation of the process under
study is necessary in order to implement a model that
is both accurate and extendible. This is particularly
true for new approaches, such as those involved in
X-ray lithography. The authors have studied the process
of image formation in X-ray lithography and have
implemented several models to predict the intensity
distribution at the wafer plane. The models can be
applied to the definition of an optimal exposure system
that will provide the maximum exposure latitude, and to
the study of new types of X-ray masks.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Electr. and Comput. Eng., Wisconsin Univ.,
Madison, WI, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "B2550G (Lithography); B2570 (Semiconductor
integrated circuits)",
corpsource = "Dept. of Electr. and Comput. Eng., Wisconsin Univ.,
Madison, WI, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Image formation; image formation; Intensity
distribution; intensity distribution; masks; Model;
model; Optimal exposure system; optimal exposure
system; semiconductor process modelling; X-ray
lithography; X-ray masks; X-ray proximity lithography",
thesaurus = "Masks; Semiconductor process modelling; X-ray
lithography",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Wilson:1993:HCS,
author = "M. N. Wilson and A. I. C. Smith and V. C. Kempson and
M. C. Townsend and J. C. Schouten and R. J. Anderson
and A. R. Jorden and V. P. Suller and M. W. Poole",
title = "The {Helios} 1 compact superconducting storage ring
{X-ray} source",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "351--371",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The basic properties of synchrotron radiation are
described, the design of storage rings to produce
synchrotron radiation is outlined, and the criteria for
matching storage ring design to the needs of X-ray
lithography are discussed. Simple scaling laws are
presented showing the benefits for a storage ring of
using the higher fields which superconducting magnets
are able to provide. Helios 1 is a compact
superconducting storage ring built by Oxford
Instruments for installation at the IBM Advanced
Lithography Facility (ALF). Design choices for
superconducting rings are discussed, and the design and
construction of Helios are described. Tests results
from the initial commissioning of Helios at Oxford are
presented.",
acknowledgement = ack-nhfb,
affiliation = "Accel. Technol. Group, Oxford Instrum. Ltd., UK",
ajournal = "IBM J. Res. Develop.",
classcodes = "A2920D (Storage rings); A2925 (Particle sources and
targets, preparation and technology); A2920L
(Synchrotrons); B7410D (Particle sources and targets);
B2550G (Lithography); B7450 (X-ray and gamma-ray
equipment)",
classification = "A2920D (Storage rings); A2920L (Synchrotrons); A2925
(Particle sources and targets, preparation and
technology); B2550G (Lithography); B7410D (Particle
sources and targets); B7450 (X-ray and gamma-ray
equipment)",
corpsource = "Accel. Technol. Group, Oxford Instrum. Ltd., UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "construction; Construction; design; Design; electron
accelerators; Helios 1; lithography; ring; storage
rings; superconducting storage; Superconducting storage
ring; synchrotron radiation; Synchrotron radiation;
synchrotrons; X-ray; X-ray production",
thesaurus = "Electron accelerators; Storage rings; Synchrotrons;
X-ray lithography; X-ray production",
treatment = "P Practical",
}
@Article{Archie:1993:PIS,
author = "Chas Archie",
title = "Performance of the {IBM} synchrotron {X-ray} source
for lithography",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "373--384",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The compact superconducting synchrotron X-ray source
at the IBM Advanced Lithography Facility in East
Fishkill, New York has been in service to customers
since the start of 1992. Its availability during
scheduled time is greater than 90\%, with recent months
frequently surpassing 95\%. Data on the long-term
behavior of the X-ray source properties and subsystem
performance are now available. The full system
continues to meet all specifications and even to
surpass them in key areas. Measured electron beam
properties such as beam size, short- and long-term
positional stability, and beam lifetime are presented.
Lifetimes greater than 20 hours for typical stored
beams have significantly simplified operations and
increased availability compared to projections. This
paper also describes some unique features of this X-ray
source and goes beyond a discussion of downtime to
describe the efforts behind the scenes to maintain and
operate it.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A2925F (Beam handling, focusing, pulsing, stripping
and diagnostics); A2920D (Storage rings); A2920L
(Synchrotrons); B7410B (Beam handling and diagnostics);
B7410D (Particle sources and targets); B7450 (X-ray and
gamma-ray equipment); B2550G (Lithography)",
classification = "A2920D (Storage rings); A2920L (Synchrotrons);
A2925F (Beam handling, focusing, pulsing, stripping and
diagnostics); B2550G (Lithography); B7410B (Beam
handling and diagnostics); B7410D (Particle sources and
targets); B7450 (X-ray and gamma-ray equipment)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "beam; Beam lifetime; beam properties; beam size; Beam
size; compact superconducting synchrotron; Compact
superconducting synchrotron; electron; electron
accelerators; Electron beam properties; Helios-1; IBM
Advanced Lithography Facility; lifetime; lithography;
Lithography; particle beam diagnostics; Positional
stability; positional stability; rings; storage;
synchrotrons; X-ray lithography; X-ray production;
X-ray source",
thesaurus = "Electron accelerators; Particle beam diagnostics;
Storage rings; Synchrotrons; X-ray lithography; X-ray
production",
treatment = "P Practical; X Experimental",
}
@Article{Leavey:1993:DCI,
author = "J. A. Leavey and L. G. Lesoine",
title = "Design considerations for the {IBM X-ray} lithography
facility",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "385--393",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Synchrotrons, like other large particle accelerators,
have historically been the tools of universities and
national laboratories for research. Moving this
technology to industry presents many challenges which
do not exist in an academic environment. One major
challenge is to develop a facility to house and support
the ring in a manufacturing-like mode where operator,
customer, and public concerns for radiation and
industrial safety is of extreme importance. This paper
describes IBM's efforts to design and build a facility
to address these safety concerns.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A2920L (Synchrotrons); B7410D (Particle sources and
targets); B2550G (Lithography); B7450 (X-ray and
gamma-ray equipment)",
classification = "A2920L (Synchrotrons); B2550G (Lithography); B7410D
(Particle sources and targets); B7450 (X-ray and
gamma-ray equipment)",
corpsource = "IBM Federal Syst. Co., Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "design; Design; facility; IBM X-ray lithography; IBM
X-ray lithography facility; industrial safety;
Industrial safety; lithography; radiation protection;
radiation safety; Radiation safety; safety;
synchrotrons; Synchrotrons; X-ray; X-ray production",
thesaurus = "Radiation protection; Safety; Synchrotrons; X-ray
lithography; X-ray production",
treatment = "P Practical; X Experimental",
}
@Article{Silverman:1993:XLB,
author = "J. P. Silverman and R. P. Rippstein and J. M.
Oberschmidt",
title = "{X-ray} lithography beamlines in the {IBM Advanced
Lithography Facility}",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "395--410",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In 1991 a storage ring designed as a source of X-rays
for X-ray lithography was delivered, installed, and
commissioned in the IBM Advanced Lithography Facility
(ALF) in East Fishkill, New York. Beamlines of two
different designs have been constructed and installed
on the ring to deliver the X-rays to the exposure
stations. One design is intended for use with a stepper
for the fabrication of integrated circuits. The second
design is for a general-purpose research and
development beamline which is used for unaligned
exposures as well as for characterization of beamline
components. The design and performance of both are
described. Special attention is given to a paraboloid
mirror optical system which is used to collimate the
radiation from the storage ring. Both the theoretical
and the measured performance of the mirror are
presented and shown to be in excellent agreement. An
exposure nonuniformity of less than +or-3\%, including
contributions from both the mirror and the beryllium
exist window, has been achieved.",
acknowledgement = ack-nhfb,
affiliation = "IBM Semicond. Res. and Dev. Center, Thomas J. Watson
Res. Center, Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A0777 (Particle beam production and handling;
targets); A4278D (Optical system design); A0785 (X-ray,
gamma-ray instruments and techniques); A4278C (Lens and
mirror design); B7410B (Beam handling and diagnostics);
B2550G (Lithography); B7450 (X-ray and gamma-ray
equipment)",
classification = "A0777 (Particle beam production and handling; A0785
(X-ray, gamma-ray instruments and techniques); A4278C
(Lens and mirror design); A4278D (Optical system
design); B2550G (Lithography); B7410B (Beam handling
and diagnostics); B7450 (X-ray and gamma-ray
equipment); targets)",
corpsource = "IBM Semicond. Res. and Dev. Center, Thomas J. Watson
Res. Center, Yorktown Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "beam handling equipment; design; Design; exposure
nonuniformity; Exposure nonuniformity; IBM Advanced;
IBM Advanced Lithography Facility; Lithography
Facility; mirrors; optics; paraboloid mirror optical;
Paraboloid mirror optical system; storage ring; Storage
ring; system; X-ray; X-ray lithography; X-ray
lithography beamlines",
thesaurus = "Beam handling equipment; Mirrors; X-ray lithography;
X-ray optics",
treatment = "P Practical; T Theoretical or Mathematical; X
Experimental",
}
@Article{Groves:1993:EBL,
author = "T. R. Groves and J. G. Hartley and H. C. Pfeiffer and
D. Puisto and D. K. Bailey",
title = "Electron beam lithography tool for manufacture of
{X-ray} masks",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "411--419",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "An electron beam lithography system suitable for
manufacturing X-ray masks with critical dimensions down
to 0.35$\mu$m is described. The system features a 50-kV
variable shaped spot electron volume with a variable
axis immersion lens. This column is capable of
maintaining 0.035-$\mu$m edge acuity of the focused
spot over a 2.1-mm deflection field. These fields are
stitched together over an 84*84-mm active pattern area
via motion of an xy table. The table position is
measured using a laser interferometer. The measurement
data are fed back to the magnetic deflection to correct
small errors. Maintaining positional accuracy of the
beam relative to the writing surface relies on a
strategy of measuring and correcting repeatable errors.
This is described in detail. Pattern placement accuracy
is 0.070$\mu$m (3 sigma) and image size control is
0.025$\mu$m (3 sigma), achieved over the entire
84*84-mm pattern area. This performance is achieved
with yield better than 90\%, as confirmed by routine
measurements. The system is currently used to
manufacture product X-ray masks with 0.35-$\mu$m
critical dimensions. Typical measurement results on
product masks are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Technol. Products, Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits); B0170E (Production facilities and
engineering); C3355Z (Other manufacturing processes);
C3120C (Spatial variables); C7410H (Instrumentation)",
classification = "B0170E (Production facilities and engineering);
B2550G (Lithography); B2570 (Semiconductor integrated
circuits); C3120C (Spatial variables); C3355Z (Other
manufacturing processes); C7410H (Instrumentation)",
corpsource = "IBM Technol. Products, Hopewell Junction, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.025 micron; 0.025 Micron; 0.07 micron; 0.07 Micron;
0.35 micron; 0.35 Micron; 50 kV; 50 KV; beam; Beam;
computerised instrumentation; electron beam
lithography; electron beam lithography system; Electron
beam lithography system; electron volume; image size
control; Image size control; integrated circuit
manufacture; manufacture; Manufacture; masks; pattern
placement accuracy; Pattern placement accuracy;
position control; positional accuracy; Positional
accuracy; ray lithography; variable axis immersion
lens; Variable axis immersion lens; variable shaped
spot; Variable shaped spot electron volume; X-; X-ray
masks; xy table; Xy table",
numericalindex = "Size 3.5E-07 m; Distance 7.0E-08 m; Voltage 5.0E+04
V; Distance 2.5E-08 m",
thesaurus = "Computerised instrumentation; Electron beam
lithography; Integrated circuit manufacture; Masks;
Position control; X-ray lithography",
treatment = "P Practical; X Experimental",
}
@Article{Blauner:1993:XMR,
author = "P. G. Blauner and J. Mauer",
title = "{X}-ray mask repair",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "421--434",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A method for repairing X-ray lithographic masks using
focused ion beam technology is described and
demonstrated. The ion beam is used for mask imaging,
for absorber milling for opaque repair, and for
deposition of X-ray-opaque material for clear repair.
Solutions to the unique problems faced in executing
these tasks on the high-resolution, high-aspect-ratio
patterns characteristic of X-ray masks are discussed.
Several effects of material redeposition during opaque
repair are explored. The significance of this same
redeposition during clear repair and the resulting
advantage gained in using a high-yield deposition
process are illustrated. Examples of repairs and
printed images of these repairs are shown for feature
sizes smaller than 0.25$\mu$m.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography); B2570 (Semiconductor integrated
circuits)",
classification = "B2550G (Lithography); B2570 (Semiconductor
integrated circuits)",
corpsource = "IBM Res. Div., Thomas J. Watson Res Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.25 micron; 0.25 Micron; absorber; Absorber milling;
deposition process; feature sizes; Feature sizes;
focused ion beam technology; Focused ion beam
technology; high-yield; High-yield deposition process;
ion beam applications; mask imaging; Mask imaging;
masks; material redeposition; Material redeposition;
milling; opaque material deposition; Opaque material
deposition; opaque repair; Opaque repair; ray
lithography; repairing; Repairing; X-; X-ray
lithographic; X-ray lithographic masks",
numericalindex = "Size 2.5E-07 m",
thesaurus = "Focused ion beam technology; Ion beam applications;
Masks; X-ray lithography",
treatment = "P Practical; X Experimental",
}
@Article{Seeger:1993:RMP,
author = "David Seeger",
title = "Resist materials and processes for {X-ray}
lithography",
journal = j-IBM-JRD,
volume = "37",
number = "3",
pages = "435--448",
month = may,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A key component that is sometimes overlooked in X-ray
lithography is the resist material. The lithographic
properties of these materials are extremely important
if one is to take advantage of the superior
lithographic performance often observed in X-ray
lithography. The properties of such materials may even
be more important than in conventional optical
lithography, since the feature sizes delineated by this
lithographic technique are much smaller. A description
of X-ray resists is presented which discusses both the
chemistry and the lithographic properties of these
materials. The characterization and stability of these
processes are highlighted.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson, Yorktown Heights, NY,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550G (Lithography)",
classification = "B2550G (Lithography)",
corpsource = "IBM Res. Div., Thomas J. Watson, Yorktown Heights, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Chemistry; chemistry; feature sizes; Feature sizes;
photoresists; radiation chemistry; Resist material;
resist material; resists; X-ray; X-ray lithography;
X-ray resists",
thesaurus = "Photoresists; Radiation chemistry; X-ray lithography",
treatment = "P Practical; X Experimental",
}
@Article{Fazzio:1993:HAD,
author = "D. P. Fazzio and M. A. Moser and C. J. Polson and J.
N. Scheffel",
title = "Head actuator dynamics of an {IBM} $5 1/4$-inch disk
drive",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "479--490",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "The IBM 5 1/4 -inch disk drive contained in the IBM
9345 DASD Module provides high track density and
storage capacity, dynamic test failure rates below
three parts per million, and low sensitivity to
assembly variations. The design techniques used to
achieve the required vibrational characteristics of the
head actuator assembly are described. Dynamic stability
specifications are derived from drive performance
requirements and the actuator servomechanical system
design. Modeshapes of the actuator are determined by
encoding magnetic patterns onto a disk and using the
read/write heads as position transducers in an
operational drive. Structural changes in the carriage
assembly that might lead to design improvements are
explored with models derived using finite element
analysis. Taguchi orthogonal matrix experiments are
used to reduce the sensitivity of the actuator to
dimensional tolerances and assembly processes. The
achievement of actuator assembly design objectives is
verified from production yields and statistical data
obtained during dynamic tests.",
acknowledgement = ack-nhfb,
affiliation = "IBM Adstar, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); C5320C (Storage on moving
magnetic media); C3260 (Actuating and final control
devices)",
classification = "B3120B (Magnetic recording); C3260 (Actuating and
final control devices); C5320C (Storage on moving
magnetic media)",
corpsource = "IBM Adstar, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "actuator servomechanical system; Actuator
servomechanical system design; actuators; analysis;
assembly variation; Assembly variation; carriage
assembly; Carriage assembly; characteristics; DASD
Module; design; dimensional tolerances; Dimensional
tolerances; dynamic stability specifications; Dynamic
stability specifications; dynamic test; Dynamic test
failure rates; dynamic tests; Dynamic tests; failure
rates; finite element; finite element analysis; Finite
element analysis; head actuator dynamics; Head actuator
dynamics; IBM 5 1/4 -inch disk drive; IBM 9345; IBM
9345 DASD Module; magnetic disc storage; modeshapes;
Modeshapes; performance requirements; Performance
requirements; sensitivity; Sensitivity; stability;
storage capacity; Storage capacity; Taguchi orthogonal
matrix; track density; Track density; vibrational;
Vibrational characteristics",
thesaurus = "Actuators; Finite element analysis; Magnetic disc
storage; Stability",
treatment = "P Practical",
}
@Article{Osborn:1993:SMM,
author = "B. E. Osborn",
title = "Statistical modeling in manufacturing: Adapting a
diagnostic tool to real-time applications",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "491--506",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper describes a process for constructing a
statistical model to automate the analysis of data from
complex diagnostic tools. The method is demonstrated on
data taken from an optical emission spectrometer (OES),
one of the most powerful tools used in semiconductor
manufacturing for detecting the chemical composition
and impurity levels in plasma processes. The analysis
of OES data currently requires hours of manual effort
by an expert spectroscopist, rendering it ineffective
for real-time monitoring and control. However, through
the use of statistical modeling, the analysis can be
performed automatically on a personal computer in a
matter of seconds. The process of model construction is
examined in general, and methods are developed for
demonstrating how information from an expert can be
combined with information from the data in order to
provide a statistical basis for analysis. The
effectiveness of the model is demonstrated on data from
typical plasma processes.",
acknowledgement = ack-nhfb,
affiliation = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7210B (Automatic test and measurement systems);
B0170E (Production facilities and engineering); C7410D
(Electronic engineering); C7410H (Instrumentation);
C7420 (Control engineering); C3355 (Manufacturing
processes)",
classification = "B0170E (Production facilities and engineering);
B7210B (Automatic test and measurement systems); C3355
(Manufacturing processes); C7410D (Electronic
engineering); C7410H (Instrumentation); C7420 (Control
engineering)",
corpsource = "IBM Enterprise Syst., Poughkeepsie, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; chemical; Chemical composition; complex
diagnostic tools; Complex diagnostic tools;
composition; computerised monitoring; diagnostic tool;
Diagnostic tool; electronic engineering computing;
impurity levels; Impurity levels; optical emission;
Optical emission spectrometer; plasma processes; Plasma
processes; process computer control; real-time;
Real-time applications; semiconductor device
manufacture; semiconductor manufacturing; Semiconductor
manufacturing; spectrometer; statistical modeling;
Statistical modeling",
thesaurus = "Computerised monitoring; Electronic engineering
computing; Process computer control; Semiconductor
device manufacture",
treatment = "A Application; P Practical",
}
@Article{Tibbitts:1993:FSC,
author = "B. R. Tibbitts",
title = "Flexible simulation of a complex semiconductor
manufacturing line using a rule-based system",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "507--521",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Rule-based systems have been used to produce fast,
flexible simulation models for semiconductor
manufacturing lines. This paper describes such a
rule-based simulator for a semiconductor manufacturing
line, and the language in which it is written. The
simulator is written in a rule-based declarative style
that uses a single-rule `template' to move thousands of
product tots through various process steps; the rule is
customized as needed with data for each step, route,
lot, tool, manpower skill, etc. Since line or product
changes require only reading new data from a database,
without reprogramming, this provides a modeling
environment that is simple, flexible, and maintainable.
The model is implemented in ECLPS (enhanced common Lisp
production system), also known as a knowledge-based or
expert systems language. It handles very large models
(thousands of data elements, or more) well and is very
fast.",
acknowledgement = ack-nhfb,
affiliation = "IBM Programming Syst., Lexington, KY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7480 (Production engineering); C6170 (Expert
systems); C7410D (Electronic engineering)",
classification = "C6170 (Expert systems); C7410D (Electronic
engineering); C7480 (Production engineering)",
corpsource = "IBM Programming Syst., Lexington, KY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "complex semiconductor manufacturing; Complex
semiconductor manufacturing line; ECLPS; electronic
engineering computing; enhanced common Lisp production;
Enhanced common Lisp production system; expert systems;
expert systems language; Expert systems language;
flexible; flexible simulation; Flexible simulation;
line; LISP; manufacture; manufacturing systems;
modeling environment; Modeling environment; rule-based
declarative style; Rule-based declarative style;
rule-based system; Rule-based system; semiconductor
device; system",
thesaurus = "Electronic engineering computing; Expert systems;
Flexible manufacturing systems; LISP; Semiconductor
device manufacture",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Grotzinger:1993:CPA,
author = "S. J. Grotzinger and R. Srinivasan and R. Akella and
S. Bollapragada",
title = "Component procurement and allocation for products
assembled to forecast: Risk-pooling effects",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "523--536",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "This paper considers procurement and allocation
policies in a manufacturing environment where common
components are assembled into various products that
have stochastic demands. The components are allocated
to the assembly of a product at a time when product
demand is still uncertain (assemble to forecast, ATF).
The special case of one component shared by N different
products is analyzed, and insights into the general
problem are obtained for the situation in which the
common component can be reallocated to different
products as product demands change. An allocation
policy is developed for general distributions and
prices in an ATF environment. The policy first
addresses anomalies in the state of the system and
then, for a feasible state, minimizes the expected
excess finished-goods inventory. A procurement level
that is nearly optimal is obtained from a Monte Carlo
simulation in which the probability of satisfying all
of the random product demands simultaneously is
considered relative to this allocation policy.
Numerical studies indicate that the total component and
finished-goods inventory is significantly reduced by an
allocation policy that incorporates risk pooling while
still fulfilling service-level requirements.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7480 (Production engineering); C3355F (Assembling);
C1140G (Monte Carlo methods)",
classification = "C1140G (Monte Carlo methods); C3355F (Assembling);
C7480 (Production engineering)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "allocation; Allocation policies; assemble to forecast;
Assemble to forecast; assembling; component
procurement; Component procurement; flexible
manufacturing systems; manufacturing environment;
Manufacturing environment; methods; Monte Carlo; Monte
Carlo simulation; policies; risk-pooling effects;
Risk-pooling effects",
thesaurus = "Assembling; Flexible manufacturing systems; Monte
Carlo methods",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Irvin:1993:MCD,
author = "D. R. Irvin",
title = "Modeling the cost of data communication for multi-node
computer networks operating in the {United States}",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "537--546",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Examines the cost of data communication for multi-node
computer networks operating in the United States. The
author begins by defining a market basket of
private-line transmission services and identifying its
constituent prices. Two analytic models are then
proposed. The first, which derives a theoretical
relationship from microeconomic considerations, gives
price movement as a function of the demand for service.
The second embodies a learning curve fit to historical
data, wherein the slope of this curve (0.71) equals the
slope of the historical curve tor the advance of
integrated-circuit technology. Extrapolations from the
two models agree well; moreover, both extrapolations
conform to long-established historical trends. These
agreements lend plausibility to the idea that the price
of data communication unfolds in an orderly way over
the long run, and, despite the perturbation introduced
by the Bell System divestiture of 1984, future price
movements may return to their traditional 11\% annual
decline.",
acknowledgement = ack-nhfb,
affiliation = "IBM Networking Syst., Research Triangle Park, NC,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C0310 (EDP management); C0230 (Economic, social and
political aspects); C5620 (Computer networks and
techniques)",
classification = "C0230 (Economic, social and political aspects);
C0310 (EDP management); C5620 (Computer networks and
techniques)",
corpsource = "IBM Networking Syst., Research Triangle Park, NC,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer networks; cost; Cost; data communication;
Data communication; economics; learning curve; Learning
curve; management; market basket; Market basket;
microeconomic considerations; Microeconomic
considerations; multi-node computer networks;
Multi-node computer networks; price movement; Price
movement; private-line transmission; Private-line
transmission services; services; telecommunication
network; United States",
thesaurus = "Computer networks; Economics; Telecommunication
network management",
treatment = "T Theoretical or Mathematical",
}
@Article{Eickemeyer:1993:LIU,
author = "R. J. Eickemeyer and S. Vassiliadis",
title = "A load instruction unit for pipelined processors",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "547--564",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A special-purpose load unit is proposed as part of a
processor design. The unit prefetches data from the
cache by predicting the address of the data fetch in
advance. This prefetch allows the cache access to take
place early, in an otherwise unused cache cycle,
eliminating one cycle from the load instruction. The
prediction also allows the cache to prefetch data if
they are not already in the cache. The cache-miss
handling can be overlapped with other instruction
execution. It is shown, using trace-driven simulations,
that the proposed mechanism, when incorporated in a
design, may contribute to a significant increase in
processor performance. The paper also compares
different prediction methods and describes a hardware
implementation for the load unit.",
acknowledgement = ack-nhfb,
affiliation = "IBM Application Bus. Syst., Rochester, MN, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220P (Parallel architecture); C6120 (File
organisation); C5470 (Performance evaluation and
testing)",
classification = "C5220P (Parallel architecture); C5470 (Performance
evaluation and testing); C6120 (File organisation)",
corpsource = "IBM Application Bus. Syst., Rochester, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "buffer storage; cache access; Cache access;
cache-miss; Cache-miss handling; handling; hardware
implementation; Hardware implementation; load
instruction unit; Load instruction unit; load unit;
performance evaluation; pipeline processing; pipelined
processors; Pipelined processors; prediction methods;
Prediction methods; processor design; Processor design;
special-purpose; Special-purpose load unit; storage
management; trace-driven simulations; Trace-driven
simulations",
thesaurus = "Buffer storage; Performance evaluation; Pipeline
processing; Storage management",
treatment = "P Practical",
}
@Article{Anonymous:1993:RPI,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "565--578",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:20:15 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1993:RIP,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "37",
number = "4",
pages = "579--580",
month = jul,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 13 07:20:19 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lim:1993:PSB,
author = "C. K. Lim and T. Caulfield and J. A. Benenati",
title = "Preface: Solder Ball Connect Technology",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "582--583",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Corbin:1993:FEA,
author = "J. S. Corbin",
title = "Finite element analysis for {Solder Ball Connect}
({SBC}) structural design optimization",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "585--596",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Solder ball connect (SBC) is a second-level surface
mount electronics packaging technology in which ceramic
modules containing one or more chips are joined to a
circuit card (FR-4) by means of an array of
nonhomogeneous solder columns. These columns consist of
a high-temperature-melting 90\%Pb/10\%Sn solder sphere
attached to the module and card with eutectic solder
fillets. The solder structures accommodate the bulk of
the strain (which is due to the thermal-expansion
mismatch between FR-4 and the 9211 ceramic of the
modules) generated during power cycling. If the solder
structures are not properly designed, the thermal
strain can be a source of premature fatigue failure. In
this work, finite element analysis is used to
characterize the plastic strains that develop in the
SBC interconnection during thermal cycling. Since
plastic strain is a dominant parameter that influences
low-cycle fatigue, it is used as a basis of comparison
for various structural alternatives. Designed
experiment techniques are used to systematically
evaluate the thermal strain sensitivity to structural
variables. Results are used to identify an optimally
reliable structure that is robust in terms of
assembly-process variables.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "PbSn/bin Pb/bin Sn/bin",
classcodes = "B2210D (Printed circuit manufacture); B0170J (Product
packaging); B0290T (Finite element analysis)",
classification = "B0170J (Product packaging); B0290T (Finite element
analysis); B2210D (Printed circuit manufacture)",
corpsource = "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "assembling; Ceramic modules; ceramic modules; Circuit
card; circuit card; columns; Eutectic solder fillets;
eutectic solder fillets; failure; FEA; FEM; finite
element analysis; Finite element analysis; finite
element analysis; FR-4; high temperature melting solder
sphere; High temperature melting solder sphere;
interconnection; level SMT packaging technology;
Low-cycle fatigue; low-cycle fatigue; mismatch; MLC
module attachment; nonhomogeneous solder;
Nonhomogeneous solder columns; Pb-Sn; PCB assembly
solder column array; plastic deformation; plastic
strains; Plastic strains; Power cycling; power cycling;
premature fatigue; Premature fatigue failure; printed
circuit manufacture; SBC; SBC interconnection; second-;
Second-level SMT packaging technology; Solder ball
connect; solder ball connect; soldering; Structural
design optimization; structural design optimization;
surface mount; Surface mount electronics; surface mount
electronics; technology; Thermal cycling; thermal
cycling; thermal strain; Thermal strain; thermal stress
cracking; thermal-expansion; Thermal-expansion
mismatch",
thesaurus = "Assembling; Finite element analysis; Plastic
deformation; Printed circuit manufacture; Soldering;
Surface mount technology; Thermal stress cracking",
treatment = "T Theoretical or Mathematical",
}
@Article{Ries:1993:ASB,
author = "M. D. Ries and D. R. Banks and D. P. Watson and K. G.
Hoebener",
title = "Attachment of {Solder Ball Connect} ({SBC}) packages
to circuit cards",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "597--608",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "IBM has developed an assembly process to attach a new
family of solder ball connect (SBC) integrated circuit
packages to glass/epoxy cards using surface mount
technology (SMT). The process provides nearly perfect
yields for the resulting solder ball joint structures
and ensures reliability by controlling wear-out due to
metallurgical fatigue. The package, card, and process
parameters found to most strongly influence the
assembly yield and reliability are summarized, and
unique test hardware and analysis techniques are
discussed. Process considerations, analytical
techniques, and test methods described for SBC packages
should apply to other ball grid array (BGA) packages.",
acknowledgement = ack-nhfb,
affiliation = "Hewlett Packand Co., Fort Collins, CO, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture); B0170J (Product
packaging); B0170N (Reliability)",
classification = "B0170J (Product packaging); B0170N (Reliability);
B2210D (Printed circuit manufacture)",
corpsource = "Hewlett Packand Co., Fort Collins, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "assembling; Assembling; assembly process; Assembly
process; assembly yield; Assembly yield; ball grid
array; Ball grid array; Ball grid array, BGA packages;
BGA packages; circuit cards; Circuit cards; circuit
reliability; Circuit reliability; glass/epoxy cards;
Glass/epoxy cards; IBM; integrated circuit; Integrated
circuit packages; manufacture; packages; printed
circuit; Printed circuit manufacture; printed circuit
testing; Printed circuit testing; reliability;
Reliability; SBC packages; SMD; SMT; solder ball
connect; Solder ball connect; surface mount; surface
mount technology; Surface mount technology; technology;
test hardware; Test hardware",
thesaurus = "Assembling; Circuit reliability; Printed circuit
manufacture; Printed circuit testing; Surface mount
technology",
treatment = "P Practical; X Experimental",
}
@Article{Mahaney:1993:TMI,
author = "H. V. Mahaney",
title = "Thermal modeling of the infrared reflow process for
{Solder Ball Connect} ({SBC})",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "609--619",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "A thermal model of the infrared reflow process has
been developed for an FR-4 card populated with an array
of solder ball connect (SBC) modules. The analysis of
the three-dimensional, transient, finite element model
accounts for radiative exchange within the infrared
oven and for the heat conduction (nonisotropic) within
the modules and card. Transient temperature profiles of
selected points and three-dimensional temperature
distributions at selected times are presented to
describe the primary heat-transport mechanisms.
Numerical predictions and empirical data indicate that
the SBC modules are relatively isothermal throughout
the infrared reflow process. Therefore, every solder
ball within the array exhibits a nearly identical
thermal profile. This result is fortunate, since the
inner solder ball connections cannot be visually
inspected. The influence of module spacing and the
ability to improve the reflow process by use of a
high-emissivity cap coating are demonstrated.",
acknowledgement = ack-nhfb,
affiliation = "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2210D (Printed circuit manufacture); B0170J (Product
packaging); B0290T (Finite element analysis)",
classification = "B0170J (Product packaging); B0290T (Finite element
analysis); B2210D (Printed circuit manufacture)",
corpsource = "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D transient FEM model; assembling; cap coating;
circuit manufacture; connect; dimensional temperature
distributions; finite element analysis; finite element
model; Finite element model; FR-4 card; heat
conduction; Heat conduction; heat-transport;
Heat-transport mechanisms; high-emissivity;
High-emissivity cap coating; infrared oven; Infrared
oven; infrared reflow process; Infrared reflow process;
IR-reflow method; mechanisms; modelling; printed;
radiative exchange; Radiative exchange; SBC modules;
solder ball; Solder ball connect; soldering; surface
mount technology; temperature distribution; temperature
profiles; thermal analysis; thermal model; Thermal
model; thermal profile; Thermal profile; three-;
Three-dimensional temperature distributions; transient;
Transient temperature profiles",
thesaurus = "Assembling; Finite element analysis; Modelling;
Printed circuit manufacture; Soldering; Surface mount
technology; Temperature distribution; Thermal
analysis",
treatment = "T Theoretical or Mathematical",
}
@Article{Wu:1993:TSC,
author = "T. Y. Wu and Y. Guo and W. T. Chen",
title = "Thermal-mechanical strain characterization for printed
wiring boards",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "621--634",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Multilayer printed wiring boards are widely used in
electronic packaging assemblies. One critical
reliability concern is the thermal-mechanical strains
induced by temperature change. For example, the
in-plane strain affects the thermal fatigue life of
surface mount solder interconnections, while the
out-of-plane strain affects the mechanical integrity of
the plated-through holes of the printed wiring boards.
For this paper, a systematic study of the
thermal-mechanical strain of epoxy-glass printed wiring
boards, below and above the glass transition
temperatures of the epoxies, has been carried out. The
study includes measurements of properties of basic
constituent materials (epoxy, glass fabric, copper), of
intermediate building blocks in the fabrication
process, and of final products. The study has led to a
quantitative engineering model that predict the average
in-plane thermal-mechanical strain for use in modeling
surface mount components on a printed wiring board, as
well as the average out-of-plane thermal-mechanical
strain for determining plated-through-hole reliability
in thermal shock processes. The reliability of surface
mount solder interconnections and plated-through holes
is discussed.",
acknowledgement = ack-nhfb,
affiliation = "Microelectronics Div., IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el",
classcodes = "B2210 (Printed circuits); B0170N (Reliability); B0550
(Composite materials)",
classification = "B0170N (Reliability); B0550 (Composite materials);
B2210 (Printed circuits)",
corpsource = "Microelectronics Div., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit reliability; circuits; Cu; deformation;
electronic; Electronic packaging assemblies;
engineering; Engineering model; epoxy-glass laminate;
Epoxy-glass laminate; fabrication process; Fabrication
process; glass fabric; Glass fabric; glass transition;
Glass transition temperatures; in-plane strain;
In-plane strain; laminates; mechanical integrity;
Mechanical integrity; model; multilayer PWB; Multilayer
PWB; out-of-plane strain; Out-of-plane strain;
packaging assemblies; plated-through holes;
Plated-through holes; printed; printed wiring boards;
Printed wiring boards; PTH reliability; strain
characterization; Strain characterization; stress
cracking; surface mount components; Surface mount
components; surface mount solder interconnections;
Surface mount solder interconnections; surface mount
technology; temperature change; Temperature change;
temperatures; thermal; thermal fatigue life; Thermal
fatigue life; thermal shock; thermal shock processes;
Thermal shock processes; thermal-mechanical strains;
Thermal-mechanical strains",
thesaurus = "Circuit reliability; Deformation; Laminates; Printed
circuits; Surface mount technology; Thermal shock;
Thermal stress cracking",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Guo:1993:SBC,
author = "Y. Guo and C. K. Lim and W. T. Chen and C. G.
Woychik",
title = "Solder ball connect ({SBC}) assemblies under thermal
loading. {I}. Deformation measurement via Moir{\'{e}}
interferometry, and its interpretation",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "635--647",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "Thermal deformations that result from mismatches of
coefficients of thermal expansion (CTE) in solder ball
connect (SBC) assemblies were investigated. The CTE
mismatches of the materials and the components in the
package have both macro and micro effects on the strain
distributions in the SBC interconnections. The geometry
of the SBC joint also has a strong influence on the
solder strains in the SBC package. An experimental
technique with high sensitivity and resolution, moire
interferometry, was used to obtain whole-field
displacements. Thermal strains in SBC packages,
especially the strain concentrations in the SBC joints,
were then determined from the displacement fields. The
experimental results played an important role in
failure analysis, structural design optimization, and
finite element model verification in the IBM SBC
program. The results also show that Moire
interferometry is a very powerful and effective tool in
experimental studies of electronic packaging.",
acknowledgement = ack-nhfb,
affiliation = "Microelectronics Div., IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B7320C (Spatial
variables); B2210 (Printed circuits)",
classification = "B0170J (Product packaging); B2210 (Printed
circuits); B7320C (Spatial variables)",
corpsource = "Microelectronics Div., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuits; coefficients of thermal; Coefficients of
thermal expansion; concentrations; CTE; CTE mismatches;
deformation; distributions; electronic packaging;
Electronic packaging; Electronic packaging,
Deformation; expansion; failure analysis; Failure
analysis; FEM model verification; finite element model;
Finite element model; IBM SBC program; light
interferometry; Light interferometry; loading; moire
fringes; moire interferometry; Moire interferometry;
Moir{\'{e}} fringes; Moir{\'{e}} interferometry; mount
technology; optimization; printed; Printed circuits;
SBC interconnections; SBC joint; SBC package; SMD
assemblies; SMT; solder; solder ball connect; Solder
ball connect; Solder strains; soldering; Soldering;
spatial variables measurement; Spatial variables
measurement; strain; Strain concentrations; Strain
distributions; strains; structural design; Structural
design optimization; surface; Surface mount technology;
thermal; thermal expansion; Thermal expansion; Thermal
loading; whole-field displacements; Whole-field
displacements",
thesaurus = "Deformation; Light interferometry; Moire fringes;
Printed circuits; Soldering; Spatial variables
measurement; Surface mount technology; Thermal
expansion",
treatment = "X Experimental",
}
@Article{Choi:1993:SBC,
author = "H.-C. Choi and Y. Guo and W. LaFontaine and C. K.
Lim",
title = "{Solder Ball Connect} ({SBC}) assemblies under thermal
loading: {II}. Strain analysis via image processing,
and reliability considerations",
journal = j-IBM-JRD,
volume = "37",
number = "5",
pages = "649--659",
month = sep,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "For pt.I see ibid., vol.37, no.5, p.649-59 (1993). A
novel approach to processing interferometric moire
images, called computational Fourier transform moire,
has been developed. The essential principle of this
technique is to automatically calculate a whole-field
strain from digitized images of interferometric moire
fringes using digital Fourier transform procedures.
With the use of this technique, a whole-field strain
distribution of a solder ball connect (SBC)
interconnection under thermal loading was obtained. The
calculated strain field was then used to understand
fatigue modes of SBC observed from an accelerated
thermal cycling (ATC) test.",
acknowledgement = ack-nhfb,
affiliation = "Microelectronics Div., IBM, Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170J (Product packaging); B2210 (Printed circuits);
B0170N (Reliability); B7320G (Force, torque and work);
B6140C (Optical information and image processing);
B0230 (Integral transforms)",
classification = "B0170J (Product packaging); B0170N (Reliability);
B0230 (Integral transforms); B2210 (Printed circuits);
B6140C (Optical information and image processing);
B7320G (Force, torque and work)",
corpsource = "Microelectronics Div., IBM, Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "accelerated thermal cycling; Accelerated thermal
cycling; circuit reliability; computational Fourier
transform moire; Computational Fourier transform moire;
deformation; digital Fourier transform procedures;
Digital Fourier transform procedures; digitized images;
Digitized images; distribution; fatigue; Fatigue modes;
Fourier; fringes; image; image processing; Image
processing; interferometric moire images;
Interferometric moire images; light interferometry;
modes; moire; printed circuits; processing;
reliability; Reliability; SBC assemblies; SBC
interconnection; solder ball connect; Solder ball
connect; soldering; strain field; Strain field; strain
measurement; surface mount technology; thermal loading;
Thermal loading; thermal stress cracking; transforms;
whole-field strain; Whole-field strain distribution",
thesaurus = "Circuit reliability; Deformation; Fatigue; Fourier
transforms; Image processing; Light interferometry;
Moire fringes; Printed circuits; Soldering; Strain
measurement; Surface mount technology; Thermal stress
cracking",
treatment = "P Practical; T Theoretical or Mathematical; X
Experimental",
}
@Article{Hauge:1993:P,
author = "P. S. Hauge",
title = "Preface",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "678--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:20 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#one",
abstract = "Thirty-seven years ago, Thomas J. Watson, Jr.,
introduced the first issue of the IBM Journal of
Research and Development with the following message:
The new IBM Journal of Research and Development is a
strong indication of the increasing emphasis we at IBM
want to place in the future on fundamental science and
technology. In the IBM Journal, our scientists and
engineers will describe their latest and most
significant new ideas and concepts, as well as new and
improved products. I hope and believe that the IBM
corporation will make real contributions to the
expanding perimeters of knowledge in the physical
sciences and mathematics, as well as in the more
specialized areas of data processing, computer
technology, and communications. The prompt publication
of new scientific and technological advances is, I
believe, of real benefit to the individual and to the
company. I also feel that it is desirable to share such
knowledge with others throughout the world as soon as
is reasonably possible. New scientific knowledge is,
without doubt, one of the greatest sources of hope for
man in our time. It can never remain the exclusive
secret of any group or nation for any considerable
period. I am convinced that, through a more widespread
and rapid publication of any additions we may make to
this store of knowledge, we at IBM can contribute
significantly to a freer exchange of ideas and
knowledge among all men. Since its creation in 1957,
the IBM Journal of Research and Development has
reflected the company's technical emphasis by
publishing 2190 papers and communications and by
listing more than 20000 US patents issued to IBM and
more than 30000 papers published by IBM authors in
other technical journals. This issue is a
thirty-seven-year Cumulative Index covering the 203
issues of the Journal published to date. The Index
consists of four parts: authors, topics, subjects, and
abstracts. Author Index Entries in the Author Index are
arranged alphabetically by the last name of the first
author. Primary entries contain the author names, the
title of the paper, the volume and issue number in
boldface, the beginning page number, and the year of
publication. If a paper has more than one author,
secondary entries appear for the additional authors.
These entries refer to the primary entry and omit the
other authors and the title. Topic Index The Topic
Index identifies those journal issues which are devoted
in whole or in part to a particular topic. Papers
belonging to these topics are listed in order of
publication. Listings include the title of the paper,
the last name of the first author, and the beginning
page number. Headings include the volume and issue
number and the year of publication. When a particular
issue contains more than one topic, the volume, issue
number, and year appear in the heading for the first
topic only. Subject-Code Listing The Subject Index was
formed by merging and editing the annual subject
indexes. Because of year-to-year variations in subject
headings, related papers do not always appear under the
same heading in the merged index. To aid in
cross-referencing the entries, each heading in the
merged index is assigned a four-character code. For
example, Scanning tunneling microscopy is SC01. All the
subject codes associated with a paper are given with
that paper each time it appears in any of the 400
subject listings. To aid in locating papers in the
Subject Index, an alphabetical listing of the codes and
subjects is provided. Subject Index Entries in the
Subject Index include the title of the paper, the last
name of the first author, the volume and issue number
(boldface), beginning page number, year of publication,
and the codes of all other subjects pertaining to that
paper. Abstracts The Abstracts section lists papers
chronologically by volume, issue, and year, in the
order in which they appear in the table of contents of
each issue. Individual entries show the title
(boldface), authors, and beginning page number of each
paper, followed by the abstract. For completeness,
material which does not contain an abstract, such as a
preface or a short communication, is noted by an entry
which contains the title, author and beginning page
number. \par
Peter S. Hauge Editor",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:CII,
author = "Anonymous",
title = "Cumulative index. {IBM J. Res. Dev., vols. 1--37
(1957--1993)}",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "679--1214",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#auth",
ZMnumber = "785.00006",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:AI,
author = "Anonymous",
title = "Author Index",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "679--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#auth",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:TI,
author = "Anonymous",
title = "Topic Index",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "745--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#topic",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:SC,
author = "Anonymous",
title = "Subject Codes",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "767--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#subcode",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:SI,
author = "Anonymous",
title = "Subject Index",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "773--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#subj",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1993:A,
author = "Anonymous",
title = "Abstracts",
journal = j-IBM-JRD,
volume = "37",
number = "6",
pages = "901--??",
month = nov,
year = "1993",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jan 3 14:24:13 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd37-6.html#abst",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Vertes:1994:MTT,
author = "A. Vertes and R. W. Dreyfus and D. E. Platt",
title = "Modeling the thermal-to-plasma transitions for {Cu}
photoablation",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "3--10",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html#one",
abstract = "Excimer laser ablation of metals starts as a thermal
process in the approximately 1 J/cm/sup 2/ fluence
range and makes a rapid transition near 5 J/cm/sup 2/
to a highly ionized plume (for 10 ns pulses). The 1-5
J/cm/sup 2/ range is of particular interest because it
overlaps the irradiance range used to fabricate
high-temperature superconductors, diamond-like carbon
films, and conducting Cu films. Covered in this paper
are analyses aimed at a quantitative evaluation of the
transition using a previously described model. The
model is based primarily on the thermal (diffusivity
and vapor pressure) properties of copper, along with
electron heating by inverse bremsstrahlung due to
electrons scattering off both neutrals and ions. The
analyses provide a good fit and insight into previously
obtained laser-induced fluorescence results for Cu/sup
0/, Cu/sup +/, and Cu$_2$. Also, the surface shadowing
and plasma heating beginning in the 5 J/cm/sup 2/ (500
MW/cm/sup 2/) region are clearly illustrated.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Chem., George Washington Univ., Washington,
DC, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/el",
classcodes = "A7920D (Laser-light impact phenomena); A6180B
(Ultraviolet, visible and infrared radiation); A8115H
(Chemical vapour deposition); A6855 (Thin film growth,
structure, and epitaxy)B0520F (Vapour deposition);
B0530 (Metals and alloys)",
classification = "A6180B (Ultraviolet, visible and infrared
radiation); A6855 (Thin film growth, structure, and
epitaxy); A7920D (Laser-light impact phenomena); A8115H
(Chemical vapour deposition); B0520F (Vapour
deposition); B0530 (Metals and alloys)",
corpsource = "Dept. of Chem., George Washington Univ., Washington,
DC, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "10 ns; 10 Ns; bremsstrahlung; conducting Cu films;
Conducting Cu films; conductivity of solids; copper;
Cu; Cu photoablation; Cu$_2$; Cu/sup +/; Cu/sup 0/;
diamond-like C films; Diamond-like C films;
diffusivity; Diffusivity; electron heating; Electron
heating; electron scattering; Electron scattering;
excimer; Excimer laser ablation; fluence; Fluence;
fluorescence; inverse; Inverse bremsstrahlung; ionized
plume; Ionized plume; irradiance range; Irradiance
range; laser ablation; laser-induced; Laser-induced
fluorescence; plasma heating; Plasma heating; pulsed
laser deposition; shadowing; surface; Surface
shadowing; thermal; thermal diffusivity; thermal
process; Thermal process; thermal-to-plasma
transitions; Thermal-to-plasma transitions; vapor
pressure; Vapor pressure; vapour pressure",
numericalindex = "Time 1.0E-08 s",
thesaurus = "Bremsstrahlung; Copper; Pulsed laser deposition;
Thermal conductivity of solids; Thermal diffusivity;
Vapour pressure",
treatment = "T Theoretical or Mathematical",
}
@Article{Kurtzberg:1994:ABC,
author = "Jerome M. Kurtzberg and Menachem Levanoni",
title = "{ABC}: a better control for manufacturing",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "11--30",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html#two",
abstract = "ABC is a generic methodology to improve the quality of
manufacturing. It can optimize operation of a single
process or an entire factory to meet or exceed product
specifications. ABC is based on three nets which
continually interact to model processes and to provide
local process control and global product optimization.
Significant process variables are identified,
evaluated, and ranked according to their contributions
to product quality. Process performance, which
determines product quality, is characterized by a
sensitive parameter, the Q-factor, which is used for
local control and for global optimization. Real-time
response maps capture process behavior and identify
current status, improved operating points, and expected
improvement in relation to design targets. ABC
continually compensates for off-specification
manufacturing steps by feedforward-and-feedback
corrective actions which keep the product on target.
ABC also evaluates and ranks the effects of non-numeric
manufacturing variables, such as specific tools and
vendors, on product quality. Total quality control can
be achieved by optimizing all variables, both
sensor-based and non-numeric, which control the
product. Some of ABC's capabilities are demonstrated in
a multistep fabrication of a semiconductor capacitor in
which the electrical properties of the product are
optimized by controlling the individual chemical
process steps. ABC's capacity to minimize scrap and
rework by compensating for out-of-control conditions is
demonstrated in this example. A functional subset of
ABC currently exists as a menu-driven tool, implemented
in APL2 on VM/CMS for mainframe computers and in the C
language for workstation platforms: RS\slash 6000
running under AIX and PS/2 under OS/2. ABC is
available, in the workstation version, as an IBM
Program Offering under the name QuMAP super(TM)-A
Better Control, and is currently used in the
semiconductor, pharmaceutical, chemical, and consumer
goods industries.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7480 (Production engineering); C7420 (Control
engineering)",
classification = "C7420 (Control engineering); C7480 (Production
engineering)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ABC; AlX; APL2; C language; generic methodology;
Generic methodology; global optimization; Global
optimization; global product optimization; Global
product optimization; manufacturing computer control;
menu-driven; Menu-driven tool; OS/2; performance;
process; Process performance; product; Product
specifications; PS/2; Q-factor; quality control;
quality of manufacturing; Quality of manufacturing;
QuMAP-A; RS/6000; specifications; tool; VM/CMS",
thesaurus = "Manufacturing computer control; Quality control",
treatment = "G General Review; P Practical",
}
@Article{Ho:1994:EHH,
author = "C.-T. Ho and S. L. Johnsson",
title = "Embedding hyperpyramids into hypercubes",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "31--45",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html#three",
ZMnumber = "819.68010",
abstract = "A P(k,d) hyperpyramid is a level structure of k
hypercubes, where the hypercube at level i is of
dimension id, and a node at level i-1 is connected to
every node in a d-dimensional subcube at level i,
except for the leaf level k. Hyperpyramids contain
pyramids as proper subgraphs. We show that a
hyperpyramid P(k,d) can be embedded in a hypercube with
minimal expansion and dilation=d. The congestion is
bounded from above by ((2/sup d/-I)/d) and from below
by 1+((2/sup d/-d)/(kd+1)). We also present embeddings
of a hyperpyramid P(k,d) together with 2/sup d/-2
hyperpyramids P(k-1,d) such that only one hypercube
node is unused. The dilation of the embedding is d+1,
with a congestion of O(2/sup d/). A corollary is that a
complete n-ary tree can be embedded in a hypercube with
dilation=max(2,(log$_2$n)) and expansion=(2/sup
k(log(2/ n)+1))(n-1)/(n/sup k+1/-1).",
acknowledgement = ack-nhfb,
affiliation = "IBM Almaden Res. Center, San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230M (Multiprocessor interconnection); C1160
(Combinatorial mathematics)",
classification = "C1160 (Combinatorial mathematics); C4230M
(Multiprocessor interconnection)",
corpsource = "IBM Almaden Res. Center, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "congestion; Congestion; dilation; Dilation; embedded
hyperpyramid; Embedded hyperpyramid; expansion;
Expansion; graph theory; hypercube networks;
hypercubes; Hypercubes; interlevel node connections;
Interlevel node connections; leaf level; Leaf level;
level structure; Level structure; n-ary tree; N-ary
tree; pyramids; Pyramids; subcube; Subcube; subgraphs;
Subgraphs; telecommunication traffic",
thesaurus = "Graph theory; Hypercube networks; Telecommunication
traffic",
treatment = "T Theoretical or Mathematical",
}
@Article{McNutt:1994:BDM,
author = "B. McNutt",
title = "Background data movement in a log-structured disk
subsystem",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "47--58",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
abstract = "The log-structured disk subsystem is a new concept for
the use of disk storage whose future application has
enormous potential. In such a subsystem, all writes are
organized into a log, each entry of which is placed
into the next available free storage. A directory
indicates the physical location of each logical object
(e.g., each file block or track image) as known to the
processor originating the I/O request. For those
objects that have been written more than once, the
directory retains the location of the most recent copy.
Other work with log-structured disk subsystems has
shown that they are capable of high write throughputs.
However, the fragmentation of free storage due to the
scattered locations of data that become out of date can
become a problem in sustained operation. To control
fragmentation, it is necessary to perform ongoing
garbage collection, in which the location of stored
data is shifted to release unused storage for re-use.
This paper introduces a mathematical model of garbage
collection, and shows how collection load relates to
the utilization of storage and the amount of locality
present in the pattern of updates. A realistic
statistical model of updates, based upon trace data
analysis, is applied. In addition, alternative policies
are examined for determining which data areas to
collect. The key conclusion of our analysis is that in
environments with the scattered update patterns typical
of database I/O, the utilization of storage must be
controlled in order to achieve the high write
throughput of which the subsystem is capable. In
addition, the presence of data locality makes it
important to take the past history of data into account
in determining the next area of storage to be
garbage-collected.",
acknowledgement = ack-nhfb,
affiliation = "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C5320C (Storage on moving
magnetic media)",
classification = "C5320C (Storage on moving magnetic media); C6120
(File organisation)",
corpsource = "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "background data movement; Background data movement;
collection load; Collection load; data analysis; data
history; Data history; data locality; Data locality;
data structures; database I/O; Database I/O; directory;
Directory; disk storage; Disk storage; free storage
fragmentation; Free storage fragmentation; garbage
collection; Garbage collection; I/O; I/O request;
log-structured disk subsystem; Log-structured disk
subsystem; magnetic disc storage; model; most recent
copy; Most recent copy; optical disc storage; release;
request; scattered data locations; Scattered data
locations; statistical; Statistical model; statistics;
storage; storage management; storage reuse; Storage
reuse; Storage utilization; stored data location;
Stored data location; sustained operation; Sustained
operation; throughputs; trace data analysis; Trace data
analysis; unused storage; Unused storage release;
update pattern; Update pattern; utilization; write;
Write throughputs",
thesaurus = "Data analysis; Data structures; Magnetic disc storage;
Optical disc storage; Statistics; Storage management",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Vassiliadis:1994:SSC,
author = "S. Vassiliadis and B. Blaner and R. J. Eickemeyer",
title = "{SCISM}: a {Scalable Compound Instruction Set
Machine}",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "59--78",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html#five",
abstract = "In this paper we describe a machine organization
suitable for RISC and CISC architectures. The proposed
organization reduces hardware complexity in parallel
instruction fetch and issue logic by minimizing
possible increases in cycle time caused by parallel
instruction issue decisions in the instruction buffer.
Furthermore, it improves instruction-level parallelism
by means of special features. The improvements are
achieved by analyzing instruction sequences and
deciding which instructions will issue and execute in
parallel prior to actual instruction fetch and issue,
by incorporating preprocessed information for parallel
issue and execution of instructions in the cache, by
categorizing instructions for parallel issue and
execution on the basis of hardware utilization rather
than opcode description, by attempting to avoid memory
interlocks through the preprocessing mechanism, and by
eliminating execution interlocks with specialized
hardware.",
acknowledgement = ack-nhfb,
affiliation = "IBM RISC Syst., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5440 (Multiprocessor
systems and techniques)",
classification = "C5220 (Computer architecture); C5440 (Multiprocessor
systems and techniques)",
corpsource = "IBM RISC Syst., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "buffer storage; cache; Cache; CISC architectures;
computer architecture; cycle time; Cycle time;
decisions; execution; execution interlocks; Execution
interlocks; hardware; hardware complexity; Hardware
complexity; Hardware utilization; instruction;
instruction buffer; Instruction buffer; instruction
categorization; Instruction categorization; Instruction
execution; instruction issue; Instruction issue
decisions; Instruction sequence analysis;
instruction-level parallelism; Instruction-level
parallelism; logic; logic design; machine; Machine
organization; memory interlocks; Memory interlocks;
multiprocessing systems; opcode description; Opcode
description; organization; parallel instruction fetch
and issue; Parallel instruction fetch and issue logic;
preprocessed information; Preprocessed information;
reduced instruction set computing; RISC architectures;
Scalable Compound Instruction Set Machine; SCISM;
sequence analysis; specialized hardware; Specialized
hardware; utilization",
thesaurus = "Buffer storage; Computer architecture; Logic design;
Multiprocessing systems; Reduced instruction set
computing",
treatment = "P Practical",
}
@Article{Kogge:1994:P,
author = "P. M. Kogge",
title = "Preface",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "115--115",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:07:52 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#one",
abstract = "Throughout the nearly four decades of its existence,
IBM's Federal Systems Company (FSC) has been a
software, systems, and products company with
significant underpinnings in advanced technology. Its
mission has been primarily to furnish IBM's largest
customer, the U.S. Government, with information
management solutions in a wide variety of areas. One
major emphasis that dates back to FSC's earliest years
a IBM's Military Products Division --- and later as
IBM's Federal Systems Division --- has been on fast,
embedded, and real-time-oriented computers for
specialized purposes. Examples range from systems for
U.S. military aircraft and submarines to reliable space
systems, such as those used on the Saturn IV moon
rocked and the Space Shuttle. A paper in the 25th
anniversary issue (September 1981) of this journal by
Olsen and Orrange summarizes many of FSC's earliest
achievements in this area. Much of that is regarded
today as structured programming has its origins in FSC
achievements such as the Real Time Computing Complex
(RTCC) for NASA's Mission Control and the
mission-critical software aboard the Space Shuttle.
Another paper in the 25th anniversary issue, this one
by James, documents some of the RTCC achievements.
Beginning in the early 1980s, the scope of FSC's
efforts expanded dramatically. A wide range of
ground-based problems began to emerge that could be
addressed with standard commercial equipment but
required FSC's expertise with real-time systems and
algorithms, as well as its ability to manage large
programming efforts. Examples include the ground
control system for the constellation of Global
Positioning System (GPS) satellites and the air traffic
control systems for the Federal Aviation Administration
(FAA). The late 1980s saw a further expansion of the
scope of its efforts, to the addressing of
computationally intensive problems in the non-aerospace
branches of the U.S. Government, such as its Treasury,
Postal, and Justice departments; problems that
complemented federal needs, such as those associated
with computer-integrated manufacturing; and problems of
concern to other governments for which variations of
FSC's expertise could provide cost-effective solutions.
This, coupled with the organizational flexibility to
deal with worldwide customers, led to its designation
as the Federal Systems Company. The papers in this
issue provide a sampling of recent FSC efforts. The
first two papers in the issue pertain to new classes of
algorithms for basic but widespread functions. The
paper by Bradford describes algorithms that extend the
use of Fourier methods for solving the Poisson
equation. The paper by Gozzo describes recursive
least-squares algorithms that promise performance
improvements in the reception of digital signals over
channels with intersymbol interference and white
Gaussian noise. Both classes of algorithms were
developed while the authors were receiving their Ph.D.
degrees under the IBM Resident Fellowship Program and
reflect needs the authors had observed prior to their
participation in the program. The papers by Pritt, by
Stiles and Glickstein, and by Arbabi et al. pertain to
methods developed to address a specific class of
applications. Pritt describes an algorithm for aligning
two or more images to ``match'' at certain points. This
is a typical step in the processing of images from
earth-observing satellites. With the anticipated flood
of data from such satellites in the future, this
approach is expected to become increasingly important.
Stiles and Glickstein describe another algorithm of
this sort. In their case, the problem is the
``optimal'' routing of a vehicle from one point to
another in multidimensional space, where the definition
of ``optimality'' can vary dramatically from
application to another, and where additional
constraints such as time, fuel, ruggedness of terrain,
and various man-made features all conspire to
complicate the problem. Uses of this approach range
from routing military aircraft in combat situations,
through unmanned ``autonomous'' vehicle navigation, to
direction fleets of vehicles under changing traffic and
pickup points. \par
The paper by Arbabi et al. addresses the
transliteration of Arabic names into non-Arabic
languages. It is an example of the emerging
multinational aspects of FSC's customers' needs and the
use of ``artificial intelligence'' methods. \par
The final two papers, by Rudd et al. and Johnson et al,
pertain to efforts closer to achieving a complete
customer solution. The paper by Rudd et al. describes
part of a 25-year involvement by FSC in using satellite
data to detect and track ballistic missile launches.
The increasing amount and resolution of data from such
satellites, couples with increased demands for more
timely and detailed results, have forced continuing
efforts to understand launch and tracking phenomena,
and the algorithms needed to process tracking data.
\par
The paper by Johnson et al. reflects a similar
long-term involvement by FSC. It describes efforts to
scramble and unscramble data in cost-efficient ways
while still maintaining a high degree of
confidentiality in the data being transferred.
Questions dealing with code strength, interoperability,
and exportability to non-U.S. customers are all
critical here and are reflected in a new approach.
\par
Peter Kogge IBM Fellow Federal Systems Company Guest
Editor",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Bradford:1994:FST,
author = "B. L. Bradford",
title = "The {Fast Staggered Transform}, composite symmetries,
and compact symmetric algorithms",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "117--129",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:07:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#two",
ZMnumber = "814.65141",
abstract = "The Fast Staggered Transform (FST) is a variant of the
fast Fourier transform (FFT) and is introduced to
simplify and unify Fourier methods for the Poisson
equation with boundary conditions specified on a
staggered grid --- one for which the boundary of the
computational domain does not coincide with grid
points, but is staggered at half grid spacings.
Composite symmetric extensions of the computational
domain are introduced for cases in which the boundary
conditions are nonsymmetric. For example, one boundary
may coincide with grid points while the opposite
boundary is staggered. This is referred to as a mixed
grid. Compact symmetric FFT and FST algorithms are a
relatively new family of algorithms which offer
significant performance improvements compared to
traditional pre- and post-processing algorithms. The
results of performance tests of both types of
algorithms are presented. Furthermore, compact
symmetric algorithms make possible the application of
Fourier methods to six mixed grid boundary conditions
which previously could not be treated by Fourier
methods.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Boulder, CO, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0290Z (Other numerical methods); B0230 (Integral
transforms)C4190 (Other numerical methods); C1130
(Integral transforms)",
classification = "B0230 (Integral transforms); B0290Z (Other numerical
methods); C1130 (Integral transforms); C4190 (Other
numerical methods)",
corpsource = "IBM Federal Syst. Co., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Boundary conditions; boundary conditions;
boundary-value problems; compact; Compact symmetric
algorithms; Composite symmetries; composite symmetries;
computational; Computational domain boundary; domain
boundary; equation; Fast Fourier transform; fast
Fourier transform; fast Fourier transforms; fast
staggered transform; Fast staggered transform; Half
grid spacings; half grid spacings; improvements; mixed
grid; Mixed grid; performance; performance evaluation;
Performance improvements; Poisson; Poisson equation;
Staggered grid; staggered grid; symmetric algorithms",
thesaurus = "Boundary-value problems; Fast Fourier transforms;
Performance evaluation",
treatment = "N New Development; T Theoretical or Mathematical",
}
@Article{Gozzo:1994:RLS,
author = "F. Gozzo",
title = "Recursive least-squares sequence estimation",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "131--156",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:08:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#three",
abstract = "A family of adaptive communication receivers based on
recursive least-squares sequence estimation (RLSSE)
algorithms is proposed which provides performance
comparable to that of conventional linear receivers,
but with reduced complexity and less sensitivity to
channel mismatch. A software-implemented version of the
linear member of the family is shown to have
performance equivalent to that of standard transversal
equalizers under ideal conditions, yet offers a drastic
improvement in white Gaussian noise mismatch
environments. An analogous performance improvement for
several test channels is also shown for
software-implemented versions of the constrained
(nonlinear) members of the family over decision
feedback equalizers. Another advantage of the RLSSE
family of receivers may be its ease of implementation,
since it should be possible to combine the functions of
channel estimation and sequence estimation on the same
chip.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Owego, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140 (Signal processing and detection); B5230
(Electromagnetic compatibility and interference); B6220
(Stations and subscriber equipment); B6250 (Radio links
and equipment); B6110 (Information theory); B0290F
(Interpolation and function approximation); C1260
(Information theory); C4130 (Interpolation and function
approximation)",
classification = "B0290F (Interpolation and function approximation);
B5230 (Electromagnetic compatibility and interference);
B6110 (Information theory); B6140 (Signal processing
and detection); B6220 (Stations and subscriber
equipment); B6250 (Radio links and equipment); C1260
(Information theory); C4130 (Interpolation and function
approximation)",
corpsource = "IBM Federal Syst. Co., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adaptive; Adaptive communication receivers; Channel
estimation; channel estimation; channel mismatch;
Channel mismatch; communication receivers; equalisers;
equipment; feedback; filtering and prediction theory;
implemented version; intersymbol interference; least
squares approximations; noise; receivers; Recursive
least-squares sequence estimation; recursive
least-squares sequence estimation; software-;
Software-implemented version; telecommunication;
telecommunication channels; Transversal equalizers;
transversal equalizers; white Gaussian; White Gaussian
noise; white noise",
thesaurus = "Equalisers; Feedback; Filtering and prediction theory;
Intersymbol interference; Least squares approximations;
Receivers; Telecommunication channels;
Telecommunication equipment; White noise",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Pritt:1994:ASI,
author = "M. D. Pritt",
title = "Automated subpixel image registration of remotely
sensed imagery",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "157--166 (or 157--165??)",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#four",
abstract = "An algorithm is described for the automated
registration of remotely sensed imagery that registers
$6000 \times 6000$ pixel images in 8--18 minutes on an
IBM RISC System\slash 6000 workstation. The resulting
registration is accurate to the subpixel level even in
the presence of noise and large areas of change in the
images. It is shown that the registration mapping
function for parallel projections has the form
$F(x,y)=A(x,y)+h(x,y)e$, where $A(x,y)$ is an affine
transformation, $h(x,y)$ is a function that depends on
the topographic heights, and $e$ is a vector that
defines the epipolar lines. The algorithm determines
the parameters of this equation using only the image
data, without knowledge of the viewing orientations or
scene point coordinates. The search for match points is
then a one-dimensional search along the epipolar lines,
which greatly increases the speed and accuracy of the
registration.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Gaithersburg, MD, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); A9365
(Data acquisition, processing and storage); B7730
(Other remote sensing applications); B6140C (Optical
information and image processing); C5260B (Computer
vision and picture processing); C7340 (Geophysics)",
classification = "A9365 (Data acquisition, processing and storage);
A9385 (Instrumentation and techniques for geophysical,
hydrospheric and lower atmosphere research); B6140C
(Optical information and image processing); B7730
(Other remote sensing applications); C5260B (Computer
vision and picture processing); C7340 (Geophysics)",
corpsource = "IBM Federal Syst. Co., Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "affine transformation; Affine transformation;
automated subpixel image registration; Automated
subpixel image registration; changing; Changing images;
computing; epipolar; Epipolar lines; geophysics
computing; IBM computers; IBM RISC System/6000
workstation; image processing; imagery; images; lines;
match points searching; Match points searching;
microcomputer applications; noise; Noise;
one-dimensional search; One-dimensional search;
parallel projections; Parallel projections; reduced
instruction set; registration mapping function;
Registration mapping function; remote sensing; remotely
sensed; Remotely sensed imagery; topographic heights;
Topographic heights; vector; Vector",
thesaurus = "Geophysics computing; IBM computers; Image processing;
Microcomputer applications; Reduced instruction set
computing; Remote sensing",
treatment = "P Practical; T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Stiles:1994:HPR,
author = "P. N. Stiles and I. S. Glickstein",
title = "Highly parallelizable route planner based on cellular
automata algorithms",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "167--181",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#five",
ZMnumber = "939.68829",
abstract = "An overview is presented of our work on a highly
parallelizable route planner that efficiently finds an
optimal route between two points; both serial and
massively parallel implementations are described. We
compare the advantages and disadvantages of the
associated search algorithm relative to other search
algorithms, and conclude with a discussion of future
extensions and related applications.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Owego, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290H (Transportation); C4240P (Parallel programming
and algorithm theory); C4220 (Automata theory); C1180
(Optimisation techniques); C1160 (Combinatorial
mathematics)",
classification = "C1160 (Combinatorial mathematics); C1180
(Optimisation techniques); C1290H (Transportation);
C4220 (Automata theory); C4240P (Parallel programming
and algorithm theory)",
corpsource = "IBM Federal Syst. Co., Owego, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; algorithms; cellular automata; Cellular
automata algorithms; highly parallelizable route
planner; Highly parallelizable route planner; massively
parallel implementations; Massively parallel
implementations; operations research; parallel
algorithms; search; Search algorithm; search problems;
transportation",
thesaurus = "Cellular automata; Operations research; Parallel
algorithms; Search problems; Transportation",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Arbabi:1994:AAN,
author = "M. Arbabi and S. M. Fischthal and V. C. Cheng and E.
Bart",
title = "Algorithms for {Arabic} name transliteration",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "183--193",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:08:20 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#six",
abstract = "An Arabic name can be written in English with many
different spellings. For example, the name Sulayman is
written only one way in Arabic. In English, this name
is written in as many as forty different ways, such as
Salayman, Seleiman, Solomon, Suleiman, and Sylayman.
Currently, Arabic linguists manually transliterate
these names --- a slow, laborious, error-prone, and
time-consuming process. We present a hybrid algorithm
which automates this process in real time using neural
networks and a knowledge-based system to vowelize
Arabic. A supervised neural network filters out
unreliable names, passing the reliable names on to the
knowledge-based system for romanization. This approach,
developed at the IBM Federal Systems Company, is
applicable to a wide variety of purposes, including
visa processing and document processing by border
patrols.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Gaithersburg, MD, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7820 (Humanities); C5290 (Neural computing
techniques); C6170 (Expert systems)",
classification = "C5290 (Neural computing techniques); C6170 (Expert
systems); C7820 (Humanities)",
corpsource = "IBM Federal Syst. Co., Gaithersburg, MD, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Arabic linguists; Arabic name transliteration; border
patrols; Border patrols; document; Document processing;
hybrid algorithm; Hybrid algorithm; knowledge based
systems; knowledge-based system; Knowledge-based
system; linguistics; neural nets; neural network;
processing; real-time; real-time automatic process;
Real-time automatic process; romanization;
Romanization; spellings; Spellings; supervised;
Supervised neural network; systems; unreliable names;
Unreliable names; visa processing; Visa processing;
vowelization; Vowelization",
thesaurus = "Knowledge based systems; Linguistics; Neural nets;
Real-time systems",
treatment = "P Practical",
}
@Article{Rudd:1994:STB,
author = "J. G. Rudd and R. A. Marsh and J. A. Roecker",
title = "Surveillance and tracking of ballistic missile
launches",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "195--216",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:08:28 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#seven",
abstract = "This paper begins with an overview of system
requirements and design issues that must be considered
in the design of algorithms and software for the
surveillance and tracking of ballistic missile
launches. Detection and tracking algorithms and
approaches are then described for the processing of
data from a single satellite and from multiple
satellites. We cover track formation, missile
detection, track extension, and global arbitration, and
indicate how these functions fit together coherently.
We include both profile-dependent and profile-free
aspects of detection, tracking, and estimation of
tactical parameters. In some instances, particularly in
the area of track monitoring and in a discussion of how
we accommodate intersatellite bias errors in
line-of-sight measurements, we describe original work
that has not been previously reported in the technical
literature.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Boulder, CO, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B7950 (Radar and tracking systems); B6140C (Optical
information and image processing); C7460 (Aerospace
engineering); C5260B (Computer vision and picture
processing)C1250 (Pattern recognition)",
classification = "B6140C (Optical information and image processing);
B7950 (Radar and tracking systems); C1250 (Pattern
recognition); C5260B (Computer vision and picture
processing); C7460 (Aerospace engineering)",
corpsource = "IBM Federal Syst. Co., Boulder, CO, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "arbitration; artificial satellites; ballistic missile
launches; Ballistic missile launches; global; Global
arbitration; image recognition; missile detection;
Missile detection; missiles; surveillance;
Surveillance; track extension; Track extension; track
formation; Track formation; track monitoring; Track
monitoring; tracking",
thesaurus = "Artificial satellites; Image recognition; Missiles;
Tracking",
treatment = "T Theoretical or Mathematical",
}
@Article{Johnson:1994:CDM,
author = "D. B. Johnson and S. M. Matyas and A. V. Le and J. D.
Wilkins",
title = "The {Commercial Data Masking Facility} ({CDMF}) data
privacy algorithm",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "217--226",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html#eight",
ZMnumber = "939.68622",
abstract = "The Commercial Data Masking Facility (CDMF) algorithm
defines a scrambling technique for data confidentiality
that uses the Data Encryption Algorithm (DEA) as the
underlying cryptographic algorithm, but weakens the
overall cryptographic operation by defining a
key-generation method that produces an effective 40-bit
DEA key instead of the 56 bits required by the
full-strength DEA. In general, products implementing
the CDMF algorithm in an appropriate manner may be
freely exported from the USA. The algorithm is thus
intended as a drop-in replacement for the DEA in
cryptographic products. Discussed in this paper are the
design requirements, rationale, strength, and
applications of the CDMF algorithm.",
acknowledgement = ack-nhfb,
affiliation = "IBM Federal Syst. Co., Manassas, VA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130S (Data security)",
classification = "C6130S (Data security)",
corpsource = "IBM Federal Syst. Co., Manassas, VA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; CDMF; commercial data masking facility;
Commercial data masking facility; cryptographic
algorithm; Cryptographic algorithm; cryptography; data
confidentiality; Data confidentiality; Data Encryption
Algorithm; data privacy; Data privacy; Data privacy
algorithm; key-generation; Key-generation",
thesaurus = "Cryptography; Data privacy",
treatment = "P Practical",
}
@Article{Anonymous:1994:RIPb,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "239--240",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:08:37 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Winograd:1994:PMS,
author = "S. Winograd and A. J. Hoffman",
title = "Preface: {Mathematical Sciences Department, IBM Thomas
J. Watson Research Center}",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "242--242",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#one",
abstract = "At various times, the IBM Journal of Research and
Development has presented special issues on the work of
the Mathematical Sciences Department at the IBM Thomas
J. Watson Research Center. Most recently, it published
in 1987 the proceedings of a symposium celebrating the
Department's 25th anniversary. The papers presented in
this issue are our response to the editor's kind
invitation to present samples of out current work. The
vitality of the Mathematical Sciences Department
depends on a lively interaction with people in science,
engineering, and business who use mathematics to solve
their problems, and with the world community of
mathematicians who are engaged in cooperatively
advancing mathematical knowledge. The Department's
position as part if the IBM Thomas J. Watson Research
Center confers special responsibilities and
opportunities. We are in a unique position to have our
mathematical work influenced by what we learn from
interacting with the world of business and product
development, while at the same time benefitting IBM and
its customers by the application of our mathematical
knowledge and expertise. The papers in this special
issue reflect the spectrum of our activities, ranging
from exploiting special features of IBM computers and
improving algorithmic performance, to solving problems
intrinsic to mathematics. No collection of eight papers
can do justice to the wide variety of activities of the
Department. While the papers in this special issue are
a representative sample of what we do, we hope that
other parts of our work will be exposed to the readers
of this journal in issues to come.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Coppersmith:1994:DES,
author = "D. Coppersmith",
title = "The {Data Encryption Standard} ({DES}) and its
strength against attacks",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "243--250",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 09:58:53 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#two",
ZMnumber = "939.68623",
abstract = "The Data Encryption Standard (DES) was developed by an
IBM team around 1974 and adopted as a national standard
in 1977. Since that time, many cryptanalysts have
attempted to find shortcuts for breaking the system. In
this paper, we examine one such attempt, the method of
differential cryptanalysis, published by Biham and
Shamir. We show some of the safeguards against
differential cryptanalysis that were built into the
system from the beginning, with the result that more
than $10^{15}$ bytes of chosen plaintext are required
for this attack to succeed.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130S (Data security)",
classification = "B6120B (Codes); C6130S (Data security)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "attacks; Attacks; breaking; cryptography; Data
Encryption Standard; differential cryptanalysis;
Differential cryptanalysis; IBM team; plaintext;
Plaintext; safeguards; Safeguards; standards; system;
System breaking",
thesaurus = "Cryptography; Standards",
treatment = "P Practical",
}
@Article{Hosking:1994:FKD,
author = "J. R. M. Hosking",
title = "The four-parameter kappa distribution",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "251--258",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:08:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#three",
abstract = "Many common probability distributions, including some
that have attracted recent interest for flood-frequency
analysis, may be regarded as special cases of a
four-parameter distribution that generalizes the
three-parameter kappa distribution of P. W. Mielke
(1973). This four-parameter kappa distribution can be
fitted to experimental data or used as a source of
artificial data in simulation studies. This paper
describes some of the properties of the four-parameter
kappa distribution, and gives an example in which it is
applied to modeling the distribution of annual maximum
precipitation data.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1140 (Probability and statistics)",
classification = "C1140 (Probability and statistics)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "annual maximum; Annual maximum precipitation data;
climatology; distributions; flood-frequency analysis;
Flood-frequency analysis; four-parameter kappa
distribution; Four-parameter kappa distribution; kappa
distribution; precipitation data; probability;
Probability distributions; rain; simulation studies;
Simulation studies; three-parameter; Three-parameter
kappa distribution",
thesaurus = "Climatology; Probability; Rain",
treatment = "T Theoretical or Mathematical",
}
@Article{Shub:1994:IFT,
author = "M. Shub",
title = "The implicit function theorem revisited",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "259--264",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#four",
abstract = "This paper is a survey of some results on Newton's
method as applied to the implicit function theorem,
homotopy methods, and Bezout's theorem. An application
to macroeconomics is also described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4150 (Nonlinear and functional equations); C1290D
(Economics and business)",
classification = "C1290D (Economics and business); C4150 (Nonlinear
and functional equations)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; Bezout's theorem; economic cybernetics;
equation solving; homotopy; Homotopy methods; implicit
function theorem; Implicit function theorem;
macroeconomics; Macroeconomics; methods; Newton's
method; nonlinear; Nonlinear equation solving;
nonlinear equations; numerical",
thesaurus = "Economic cybernetics; Nonlinear equations; Numerical
analysis",
treatment = "T Theoretical or Mathematical",
}
@Article{Agarwal:1994:IPL,
author = "R. C. Agarwal and F. G. Gustavson and M. Zubair",
title = "Improving performance of linear algebra algorithms for
dense matrices, using algorithmic prefetch",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "265--275",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#five",
ZMnumber = "826.68051",
abstract = "In this paper, we introduce a concept called
algorithmic prefetching, for exploiting some of the
features of the IBM RISC System\slash 6000* computer.
Algorithmic prefetching denotes changing algorithm A to
algorithm B, which contains additional steps to move
data from slower levels of memory to faster levels,
with the aim that algorithm B outperform algorithm A.
The objective of algorithmic prefetching is to minimize
any penalty due to cache misses in the innermost loop
of an algorithm. This concept, along with ``cache
blocking,'' can be exploited to improve the performance
of linear algebra algorithms for dense matrices. We
experimentally demonstrated the impact of prefetching
on two dense-matrix operations. For one operation, the
performance was improved from 74\% of peak to 89\% of
peak by algorithmic prefetching; for the second
operation, it was improved from 73\% to 87\% of the
peak performance.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4140 (Linear algebra); C4240 (Programming and
algorithm theory)",
classification = "C4140 (Linear algebra); C4240 (Programming and
algorithm theory)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm theory; algorithmic; Algorithmic prefetch;
buffer storage; cache blocking; Cache blocking; dense
matrices,; Dense matrices,; IBM RISC System/6000
computer; linear algebra algorithms; Linear algebra
algorithms; matrix algebra; prefetch",
thesaurus = "Algorithm theory; Buffer storage; Matrix algebra",
treatment = "T Theoretical or Mathematical",
}
@Article{Mhaskar:1994:DIB,
author = "H. N. Mhaskar and C. A. Micchelli",
title = "Dimension-independent bounds on the degree of
approximation by neural networks",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "277--284",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 12:42:20 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#six",
ZMnumber = "823.41012",
abstract = "Let $\phi$ be a univariate $2 \pi$-periodic function.
Suppose that $s >= 1$ and $f$ is a $2 \pi$-periodic
function of $s$ real variables. We study sufficient
conditions in order that a neural network having a
single hidden layer consisting of $n$ neurons, each
with an activation function $\phi$, can be constructed
so as to give a mean square approximation to $f$ within
a given accuracy $\epsilon_n$, independent of the
number of variables. We also discuss the case in which
the activation function $\phi$ is not
$2\pi$-periodic.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Maths. and Comput. Sci., California State
Univ., Los Angeles, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1230D (Neural nets); C4130 (Interpolation and
function approximation); C5290 (Neural computing
techniques)",
classification = "C1230D (Neural nets); C4130 (Interpolation and
function approximation); C5290 (Neural computing
techniques)",
corpsource = "Dept. of Maths. and Comput. Sci., California State
Univ., Los Angeles, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "activation function; Activation function; degree of
approximation; Degree of approximation;
dimension-independent bounds; Dimension-independent
bounds; feedforward neural nets; function
approximation; functions; hidden layer; mean square
approximation; Mean square approximation; neural
networks; Neural networks; single; Single hidden layer;
transfer; univariate 2 pi -periodic function;
Univariate 2 pi -periodic function",
thesaurus = "Feedforward neural nets; Function approximation;
Transfer functions",
treatment = "T Theoretical or Mathematical",
}
@Article{Chesshire:1994:EPD,
author = "G. Chesshire and V. K. Naik",
title = "An environment for parallel and distributed
computation with application to overlapping grids",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "285--300",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#seven",
abstract = "We describe an environment for efficient and scalable
implementation of large scientific applications on
parallel and distributed computing systems. We show how
this environment is used to support overlapping grid
methods. In addition to providing a user interface that
reduces programming complexity, the environment
facilitates dynamic partitioning of data and the
scheduling of both computations and communication,
transparent to the user. After describing the user
interface and some of the implementation issues, we
present performance data for a model application
executed on two different systems: an eight-processor
IBM Power Parallel Prototype (PPP) system and a
32-processor IBM POWER Visualization System* (PVS).",
acknowledgement = ack-nhfb,
affiliation = "Los Alamos Nat. Lab., NM, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems); C6115 (Programming
support); C6160 (Database management systems (DBMS));
C6180 (User interfaces)",
classification = "C6115 (Programming support); C6150N (Distributed
systems); C6160 (Database management systems (DBMS));
C6180 (User interfaces)",
corpsource = "Los Alamos Nat. Lab., NM, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "applications; computers; database management systems;
distributed computation; Distributed computation;
distributed memory systems; distributed-memory systems;
Distributed-memory systems; DSK; dynamic; Dynamic
partitioning; environments; FORTRAN programs;
hierarchical data; Hierarchical data structures; IBM;
IBM Power; IBM Power Parallel Prototype; IBM POWER
Visualization System; large scientific; Large
scientific applications; multiprocessing programs;
overlapping grids; Overlapping grids; parallel
computing; Parallel computing; Parallel Prototype;
partitioning; performance data; Performance data;
portable scientific database package; Portable
scientific database package; programming; scheduling;
Scheduling; structures; user interface; User interface;
user interfaces",
thesaurus = "Database management systems; Distributed memory
systems; IBM computers; Multiprocessing programs;
Programming environments; User interfaces",
treatment = "P Practical",
}
@Article{Denardo:1994:NAP,
author = "E. V. Denardo and A. J. Hoffman and T. Mackenzie and
W. R. Pulleyblank",
title = "A nonlinear allocation problem",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "301--306",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#eight",
abstract = "We consider the problem of deploying work force to
tasks in a project network for which the time required
to perform each task depends on the assignment of work
force to the task, for the purpose of minimizing the
time to complete the project. The rules governing the
deployment of work force and the resulting changes in
task times of our problem are discussed in the contexts
of (a) related work on project networks and (b) more
general allocation problems on polytopes. We prove
that, for these problems, the obvious lower bound for
project completion time is attainable.",
acknowledgement = ack-nhfb,
affiliation = "Center for Syst. Sci., Yale Univ., New Haven, CT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1290F (Industry)",
classification = "C1290F (Industry)",
corpsource = "Center for Syst. Sci., Yale Univ., New Haven, CT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "acyclic directed graph; Acyclic directed graph; lower
bound; Lower bound; network; nonlinear allocation
problem; Nonlinear allocation problem; PERT; PERT
network; polytopes; Polytopes; project completion time;
Project completion time; project management; project
network; Project network; resource allocation; work
force; Work force",
thesaurus = "PERT; Project management; Resource allocation",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Jensen:1994:CMB,
author = "D. L. Jensen and R. A. Polyak",
title = "The convergence of a modified barrier method for
convex programming",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "307--321",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html#nine",
abstract = "We show, using elementary considerations, that a
modified barrier function method for the solution of
convex programming problems converges for any fixed
positive setting of the barrier parameter. With mild
conditions on the primal and dual feasible regions, we
show how to use the modified barrier function method to
obtain primal and dual optimal solutions, even in the
presence of degeneracy. We illustrate the argument for
convergence in the case of linear programming, and then
generalize it to the convex programming case.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0260 (Optimisation techniques); B0290H (Linear
algebra); C1180 (Optimisation techniques); C4130
(Interpolation and function approximation)",
classification = "B0260 (Optimisation techniques); B0290H (Linear
algebra); C1180 (Optimisation techniques); C4130
(Interpolation and function approximation)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "convergence; Convergence; convergence of numerical
methods; convex programming; Convex programming;
degeneracy; Degeneracy; feasible regions; Feasible
regions; fixed positive setting; Fixed positive
setting; linear; Linear programming; modified barrier
method; Modified barrier method; programming",
thesaurus = "Convergence of numerical methods; Convex programming;
Linear programming",
treatment = "T Theoretical or Mathematical",
}
@Article{Mittal:1994:PAS,
author = "K. L. Mittal",
title = "Preface: Adhesion Science and Technology",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "346--346",
month = apr,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:13:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#one",
abstract = "Adhesion between similar or dissimilar materials is of
vital importance to IBM in the manufacture of products
such as multilayer electronic devices and integrated
circuits, printed circuit boards, and magnetic head and
disk assemblies. For products to function reliably and
reproducibly, ways must be devised to understand and
tailor the requisite adhesion strengths between
materials. Strictly speaking, adhesion is an
interfacial phenomenon, but the overall adhesion
strength, commonly referred to as practical adhesion,
is generally determined by the properties of an
interfacial region or ``interphase'' between the two
materials, which differ from those of the two
contiguous bulk phases. An interphase might be present
naturally or be created by interactions, such as
diffusion, between the adhering phases. Desirable
interphases are obtained by introducing coupling agents
or adhesion promoters, by enhancing interdiffusion, by
application of a surface modification technique, or by
eliminating unwanted surfaces. The ability to
accurately measure the properties of relevant surfaces
and interphases and correlate them with adhesion
strength enhances our understanding of the factors that
affect adhesion. The increased availability of modern
analytical techniques and experimental tools, as well
as novel theoretical approaches, has opened new vistas
to achieving this understanding. The eight papers in
this special issue of the IBM Journal of Research and
Development highlight developments in adhesion science
and technology that are currently of interest within
IBM. The first three papers focus on the fundamental
aspects of adhesion. In the first paper, Durig analyzes
metal tip-sample interactions which occur in a scanning
tunneling microscope during vacuum tunneling at
distances where electron wave functions overlap
appreciably. These interactions are associated with
adhesion at an atomic level. The next paper, by
Thouless, examines aspects of the fracture mechanics of
thin-film adhesion. The author reviews the essential
elements of the mechanics of delamination and discusses
their implications for flaw-tolerant design of
structures involving thin films. In the third paper,
Brown reviews recent work that relates to adhesion
between noninteracting polymers. Advances in the
understanding of adhesion failure between polymers and
the interpretation of adhesion tests are discussed. The
use of copolymers as coupling agents to improve
adhesion between immiscible polymers is also described.
The fourth paper, by Spool, reviews the application of
static and dynamic secondary ion mass spectroscopy
(SIMS) as analytical tools for identifying factors that
affect adhesion. The high mass resolution of SIMS makes
it particularly useful in identifying trace impurities
at surfaces and diffusion of species near the
interfacial region. Spool cites examples of the utility
of static SIMS in gaining an understanding of the
nature of failed surfaces, of pre-bonding treatments,
of adhesion-weakening contaminants, and of adhesion
promoters. The next four papers are primarily concerned
with ways to improve adhesion. The review paper by
Baglin focuses on ion beam techniques to improve
adhesion of thin films to a variety of substrates. The
techniques discussed are reactive and nonreactive ion
beam sputtering, ion-beam-assisted deposition, ion beam
stitching, and ion implantation. Eclectic examples are
cited to show enhancements in adhesion strengths that
are a result of ion beam treatments. The paper by
Egitto and Matienzo reviews plasma technology and its
ability to modify polymer surfaces to improve adhesion
characteristics without affecting the bulk properties
of the polymer. Plasmas enhance adhesion by removing
contaminants, roughening surfaces, and introducing
reactive chemical groups. In the next paper, Saraf et
al. demonstrate that adhesion to a flexible polyimide
surface can be enhanced after replacing a single
polyimide precursor with a blend of two precursors. An
improvement in adhesion to such a polyimide surface is
attributed to increased surface roughening, a more
isotropic polymer chain ordering within the film and a
modified near-surface morphology. The last paper, by
Lee and Viehbeck, is an overview of recent work on
wet-process surface modifications of polymers. Wet
processing is simple, low-cost processing that improves
adhesion to the polymers by introducing reactive
functional groups at the surface and by enhancing
interdiffusion between polymers. \par
In concluding, I wish to thank the authors of the
submitted papers and the referees and express my hope
that readers of this issue of the IBM Journal of
Research and Development will find the papers both
interesting and informative. \par
Dr. K. L. Mittal, Guest Editor 92 Saddle Ridge Drive
Hopewell Junction, NY 12533 Previous affiliation: Skill
Dynamics An IBM Company",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Durig:1994:ASM,
author = "U. D{\"u}rig",
title = "Atomic-scale metal adhesion investigated by scanning
tunneling microscopy",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "347--366",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#two",
abstract = "The interaction of a sharply pointed metal tip with a
metal surface is investigated both theoretically and
experimentally. By resorting to an effective potential
approach, the characteristics of tip-sample forces are
analyzed systematically in terms of known theory of
bulk metal adhesion. Experiments probing the
short-range adhesion interaction by means of a
combination of force gradient sensing with tunneling
microscopy are described. It is found that the concepts
based on adhesion at a macroscopic level are not
generally applicable in describing the observed
tip-sample force gradient characteristics. These
characteristics can, however, be explained in a
semiquantitative way using effective interactions
determined from a cluster calculation. It is also shown
that the chemical information obtained by probing
short-range interactions can be used to identify
adsorbates on metal surfaces.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Lab., Ruschlikon, Switzerland",
ajournal = "IBM J. Res. Develop.",
classcodes = "A6820 (Solid surface structure); A6116P (Scanning
tunnelling microscopy and related techniques); A8190
(Other topics in materials science)",
classification = "A6116P (Scanning tunnelling microscopy and related
techniques); A6820 (Solid surface structure); A8190
(Other topics in materials science)",
corpsource = "IBM Res. Lab., Ruschlikon, Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; adhesion interaction; Adsorbates;
adsorbates; Atomic scale metal adhesion; atomic scale
metal adhesion; Cluster calculation; cluster
calculation; effective; Effective interactions;
Effective potential approach; effective potential
approach; Electron wave function overlap; electron wave
function overlap; exchange interactions (electron);
Exchange-correlation interaction; exchange-correlation
interaction; Force gradient sensing; force gradient
sensing; interactions; Metal surface; metal surface;
metals; microscopy; nanotechnology; scanning tunneling;
Scanning tunneling microscopy; scanning tunnelling
microscopy; Sharply pointed metal tip; sharply pointed
metal tip; short-range; Short-range adhesion
interaction; Tip-sample forces; tip-sample forces",
thesaurus = "Adhesion; Exchange interactions [electron]; Metals;
Nanotechnology; Scanning tunnelling microscopy",
treatment = "T Theoretical or Mathematical; X Experimental",
}
@Article{Thouless:1994:FMT,
author = "M. D. Thouless",
title = "Fracture mechanics for thin-film adhesion",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "367--377",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#three",
abstract = "The essential elements of the mechanics of
delamination are reviewed and their implications for
design are discussed. Two important concepts for the
prediction of the reliability of thin-film systems are
emphasized: (1) limiting solutions for the
crack-driving force that are independent of flaw size,
and (2) ``mixed-mode fracture.'' Consideration of the
first concept highlights the possibility of
flaw-tolerant design in which the statistical effects
associated with flaw distributions can be eliminated.
The significance of mode-mixedness includes its effect
on crack trajectories and on the interface toughness,
two key variables in determining failure mechanisms.
Theoretical predictions are given for some cases of
delamination of thin films under compressive stresses,
and the results are compared with experimental
observations to illustrate appropriate design criteria
for the model systems studied.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8190 (Other topics in materials science); A0130R
(Reviews and tutorial papers; resource letters); A6860
(Physical properties of thin films, nonelectronic);
A8140N (Fatigue, embrittlement, and fracture); A6220M
(Fatigue, brittleness, fracture, and cracks); A8160
(Corrosion, oxidation, etching, and other surface
treatments)",
classification = "A0130R (Reviews and tutorial papers; A6220M
(Fatigue, brittleness, fracture, and cracks); A6860
(Physical properties of thin films, nonelectronic);
A8140N (Fatigue, embrittlement, and fracture); A8160
(Corrosion, oxidation, etching, and other surface
treatments); A8190 (Other topics in materials science);
resource letters)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; compressive stresses; Compressive stresses;
crack trajectories; Crack trajectories; crack-driving
force; Crack-driving force; delamination; flaw-tolerant
design; Flaw-tolerant design; fracture; fracture
mechanics; interface toughness; Interface toughness;
limiting solutions; Limiting solutions; mechanics of
delamination; Mechanics of delamination; mixed-mode;
Mixed-mode fracture; reliability; Reliability; reviews;
thin films; thin-film adhesion; Thin-film adhesion;
toughness",
thesaurus = "Adhesion; Delamination; Fracture mechanics; Fracture
toughness; Reviews; Thin films",
treatment = "G General Review",
}
@Article{Brown:1994:ABP,
author = "H. R. Brown",
title = "Adhesion between polymers",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "379--389",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#four",
abstract = "This paper is concerned with recent work that relates
to the adhesion between nonreacting polymers. Advances
in the understanding of cracks at bimaterial interfaces
are considered, with particular emphasis on their
implications in the interpretation of adhesion tests.
An interpretation of the peel and blister tests is then
discussed. Consideration is given to mechanisms of
polymer failure as they relate to adhesion, with an
emphasis on the distinctions between the properties of
glassy and elastomeric materials. Polymer self-adhesion
and its relation to interdiffusion are reviewed and
compared with the adhesion of miscible polymers. In
considering the adhesion between immiscible polymers,
emphasis is given to the use of copolymers as coupling
agents at the interface.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almadens Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8190 (Other topics in materials science); A0130R
(Reviews and tutorial papers; resource letters); A6890
(Other topics in the structure and nonelectronic
properties of surfaces and thin films); A8170
(Materials testing)",
classification = "A0130R (Reviews and tutorial papers; A6890 (Other
topics in the structure and nonelectronic properties of
surfaces and thin films); A8170 (Materials testing);
A8190 (Other topics in materials science); resource
letters)",
corpsource = "IBM Res. Div., Almadens Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; Adhesion; adhesion tests; Adhesion tests;
bimaterial interfaces; Bimaterial interfaces; blister
tests; Blister tests; copolymers; Copolymers; coupling
agents; Coupling agents; elastomeric materials;
Elastomeric materials; glassy materials; Glassy
materials; immiscible polymers; Immiscible polymers;
materials testing; miscible polymers; Miscible
polymers; nonreacting polymers; Nonreacting polymers;
peel tests; Peel tests; polyimides; Polyimides; polymer
blends; polymers; reviews; self-; Self-adhesion;
thermoplastics; Thermoplastics",
thesaurus = "Adhesion; Materials testing; Polymer blends; Polymers;
Reviews",
treatment = "B Bibliography; G General Review",
}
@Article{Spool:1994:SAS,
author = "A. M. Spool",
title = "Studies of adhesion by secondary ion mass
spectrometry",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "391--411",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#five",
abstract = "The study of adhesion requires the characterization of
surfaces and interfaces. One surface analytical
technique which has been used extensively in the study
of adhesion is secondary ion mass spectrometry (SIMS).
This paper provides a brief introduction to the basis
of this technique and describes the two broad
categories of SIMS analyses: static and dynamic. A
complete literature review of the applications of SIMS
to the study of adhesion follows. The papers reviewed
are organized into a series of topics including the
nature of surfaces produced by pre-bonding treatments,
contamination which produces adhesion loss, polymer
damage at interfaces, silanes and adhesion,
characterization of polymer/polymer interfaces, and
measurements of interface widths by SIMS.",
acknowledgement = ack-nhfb,
affiliation = "IBM Storage Syst. Div., San Jose, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8280M (Mass spectrometry (chemical analysis)); A0130R
(Reviews and tutorial papers; resource letters); A8190
(Other topics in materials science); A7920N (Atom-,
molecule-, and ion-surface impact); A0775 (Mass
spectrometers and mass spectrometry techniques); A8170
(Materials testing); A6890 (Other topics in the
structure and nonelectronic properties of surfaces and
thin films)",
classification = "A0130R (Reviews and tutorial papers; A0775 (Mass
spectrometers and mass spectrometry techniques); A6890
(Other topics in the structure and nonelectronic
properties of surfaces and thin films); A7920N (Atom-,
molecule-, and ion-surface impact); A8170 (Materials
testing); A8190 (Other topics in materials science);
A8280M (Mass spectrometry (chemical analysis));
resource letters)",
corpsource = "IBM Storage Syst. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; Adhesion; adhesion loss; Adhesion loss;
analytical technique; contamination; Contamination;
interface widths; Interface widths; mass spectroscopic
chemical analysis; polymer damage at interfaces;
Polymer damage at interfaces; polymer/polymer
interfaces; Polymer/polymer interfaces; polymers;
pre-bonding treatments; Pre-bonding treatments;
reviews; secondary ion mass spectrometry; Secondary ion
mass spectrometry; secondary ion mass spectroscopy;
silanes; Silanes; surface; Surface analytical
technique",
thesaurus = "Adhesion; Mass spectroscopic chemical analysis;
Polymers; Reviews; Secondary ion mass spectroscopy",
treatment = "B Bibliography; G General Review",
}
@Article{Baglin:1994:TFB,
author = "J. E. E. Baglin",
title = "Thin film bonding using ion beam techniques --- a
review",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "413--422",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#six",
abstract = "This review describes the established techniques of
reactive and nonreactive ion beam sputtering,
ion-beam-assisted deposition, ion implantation, and ion
beam stitching. It then presents representative
examples of adhesion enhancement selected from the
current literature, in order to clarify the roles of
interface chemistry, morphology, contaminants, and
stability. The review offers a basis upon which
interface tailoring for adhesion may be planned in
order to optimize both performance and fabrication of
specific materials systems.",
abstract-2 = "Ion beam technologies provide a variety of well-proven
means for creating or enhancing strong, stable, direct
adhesion of thin films deposited on substrates.
Interface chemical bonding and structure are critical.
Yet success with such approaches has been reported for
a great variety of systems that have little or no bulk
chemical affinity, including metals, polymers,
ceramics, and semiconductors. This review paper
describes the established techniques of reactive and
nonreactive ion beam sputtering, ion-beam-assisted
deposition, ion implantation, and ion beam stitching.
It then presents representative examples of adhesion
enhancement selected from the current literature, in
order to clarify the roles of interface chemistry,
morphology, contaminants, and stability. The review
offers a basis upon which interface tailoring for
adhesion may be planned in order to optimize both
performance and fabrication of specific materials
systems.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8190 (Other topics in materials science); A0130R
(Reviews and tutorial papers; resource letters); A6860
(Physical properties of thin films, nonelectronic);
A7920N (Atom-, molecule-, and ion-surface impact);
A8115J (Ion plating and other vapour deposition);
A8115C (Deposition by sputtering); A8160 (Corrosion,
oxidation, etching, and other surface treatments);
B0500 (Materials science for electrical and electronic
engineering); B2550E (Surface treatment for
semiconductor devices)",
classification = "A0130R (Reviews and tutorial papers; A6860 (Physical
properties of thin films, nonelectronic); A7920N
(Atom-, molecule-, and ion-surface impact); A8115C
(Deposition by sputtering); A8115J (Ion plating and
other vapour deposition); A8160 (Corrosion, oxidation,
etching, and other surface treatments); A8190 (Other
topics in materials science); B0500 (Materials science
for electrical and electronic engineering); B2550E
(Surface treatment for semiconductor devices); resource
letters)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; Adhesion enhancement; adhesion enhancement;
assisted deposition; Contaminants; contaminants;
deposition; implantation; interface chemistry;
Interface chemistry; interface structure; Interface
tailoring; interface tailoring; ion; ion beam; ion beam
applications; Ion beam stitching; ion beam stitching;
Ion beam techniques; ion implantation; Ion
implantation; ion-beam-; Ion-beam-assisted deposition;
joining processes; Morphology; morphology; nonreactive
ion beam sputtering; Nonreactive ion beam sputtering;
reactive ion beam sputtering; Reactive ion beam
sputtering; reviews; sputter; stability; Stability;
surface treatment; techniques; thin film bonding; Thin
film bonding; thin films",
thesaurus = "Adhesion; Interface structure; Ion beam applications;
Ion implantation; Joining processes; Reviews; Sputter
deposition; Surface treatment; Thin films",
treatment = "G General Review",
}
@Article{Egitto:1994:PMP,
author = "F. D. Egitto and L. J. Matienzo",
title = "Plasma modification of polymer surfaces for adhesion
improvement",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "423--439",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#seven",
abstract = "Polymers have wide-ranging applications in food
packaging and decorative products, and as insulation
for electronic devices. For these applications, the
adhesion of materials deposited onto polymer substrates
is of primary importance. Not all polymer surfaces
possess the required physical and/or chemical
properties for good adhesion. Plasma treatment is one
means of modifying polymer surfaces to improve adhesion
while maintaining the desirable properties of the bulk
material. This paper addresses the interaction of
organic surfaces with the various components of a
plasma, with examples taken from a review of the
pertinent literature.",
acknowledgement = ack-nhfb,
affiliation = "IBM Microelectron Div., Endicott, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "A8160J (Surface treatment and degradation of polymers
and plastics); A0130R (Reviews and tutorial papers;
resource letters); A8190 (Other topics in materials
science); B0560 (Polymers and plastics (engineering
materials science)); B2550E (Surface treatment for
semiconductor devices)",
classification = "A0130R (Reviews and tutorial papers; A8160J (Surface
treatment and degradation of polymers and plastics);
A8190 (Other topics in materials science); B0560
(Polymers and plastics (engineering materials
science)); B2550E (Surface treatment for semiconductor
devices); resource letters)",
corpsource = "IBM Microelectron Div., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; adhesion improvement; Adhesion improvement;
decorative; Decorative products; food packaging; Food
packaging; insulation for electronic devices;
Insulation for electronic devices; plasma applications;
plasma modification; Plasma modification;
plasma-polymer interactions; Plasma-polymer
interactions; polymer; Polymer surfaces; polymers;
products; reviews; surface; surfaces; treatment",
thesaurus = "Adhesion; Plasma applications; Polymers; Reviews;
Surface treatment",
treatment = "B Bibliography; G General Review",
}
@Article{Saraf:1994:TSM,
author = "R. F. Saraf and J. M. Roldan and T. Derderian",
title = "Tailoring the surface morphology of polyimide for
improved adhesion",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "441--456",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#eight",
abstract = "Semiflexible polyimide structures are not amenable to
good adhesion because of their (a) spontaneous
orientation of the polymer chains parallel to the film
substrate during curing, (b) formation of an ordered
skin, and (c) smooth surface topography. The authors
briefly discuss these structural features with regard
to metal-on-polyimide (metal/PI) adhesion. A method is
proposed to improve adhesion by tailoring the surface
and bulk morphology of the PI to circumvent these
properties. In this method, different precursors of the
same polyimide (PMDA-ODA) are blended. Phase separation
induces spontaneous roughening of the PI surface. This
novel technique reduces the extent of chain
orientation, gives rise to topographical and
morphological surface heterogeneities, and produces a
discontinuous ordered skin. A variety of topographical
features with nanoscale dimensions are produced that
range from `mounds' to `dimples'.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el",
classcodes = "A8160J (Surface treatment and degradation of polymers
and plastics); A6820 (Solid surface structure); A8190
(Other topics in materials science); A6140K (Structure
of polymers, elastomers, and plastics); B0560 (Polymers
and plastics (engineering materials science)); B2550E
(Surface treatment for semiconductor devices)",
classification = "A6140K (Structure of polymers, elastomers, and
plastics); A6820 (Solid surface structure); A8160J
(Surface treatment and degradation of polymers and
plastics); A8190 (Other topics in materials science);
B0560 (Polymers and plastics (engineering materials
science)); B2550E (Surface treatment for semiconductor
devices)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; blended polyimide precursors; Blended
polyimide precursors; chain orientation; Chain
orientation; Cu; dimples; Dimples; discontinuous
ordered skin; Discontinuous ordered skin; improved
adhesion; Improved adhesion; metal-polymer adhesion;
Metal-polymer adhesion; morphology; morphology
tailoring; Morphology tailoring; mounds; Mounds;
nanoscale dimensions; Nanoscale dimensions;
nanotechnology; phase; Phase separation;
poly(pyromellitic dianhydride-oxydianiline);
Poly(pyromellitic dianhydride-oxydianiline); polyimide;
Polyimide; polymer blends; polymer structure; polymers;
roughening; semiflexible polyimides; Semiflexible
polyimides; separation; spontaneous; Spontaneous
roughening; surface; surface heterogeneities; Surface
heterogeneities; Surface morphology; surface
topography; surface treatment",
thesaurus = "Adhesion; Nanotechnology; Polymer blends; Polymer
structure; Polymers; Surface topography; Surface
treatment",
treatment = "X Experimental",
}
@Article{Lee:1994:WPS,
author = "K. W. Lee and A. Viehbeck",
title = "Wet-process surface modification of dielectric
polymers: {Adhesion} enhancement and metallization",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "457--474",
month = jul,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html#nine",
abstract = "For many electronic applications, the surface of a
dielectric polymer must be modified to obtain the
desired surface properties, such as wetting, adhesion,
and moisture barrier, without altering the bulk
properties. This paper reviews wet- process
modifications of dielectric polymer surfaces and also
presents unpublished results related to fluorinated
polyimides. In a typical wet process, a substrate is
immersed in or sprayed with a chemical solution, rinsed
with a solvent to remove the excess reagents, and then
dried if necessary. Wet processing can provide greatly
enhanced adhesion and reliability of the adherate (top)
layer to the modified polymer surface (adherend). We
discuss (a) the wet-process modification of various
polymers (e.g., PMDA-ODA, BPDA-PDA, 6FDA-ODA, PTFE,
PCTFE); (b) polyimide/polyimide and PCTFE/glass
adhesion, and (c) the surface chemistry and the
adhesion at a fluorinated polyimide (6FDA-ODA) surface.
Entanglement of polymer chains plays an important role
in polyimide/polyimide adhesion, while chemical
reactions are the major contributors to PCTFE/glass
adhesion strength. The metallization of dielectric
substrates often requires surface pretreatments or
conditioning by wet processes to sensitize a polymer
surface for deposition of a metal seed layer. After
seeding, a thick layer of a conducting metal (e.g., Cu)
is deposited by electroless or electrolytic plating.
Unlike dry or high-vacuum processing of polymer
surfaces, the chemistry of a wet-processed polymer
surface can be well charac- terized and often defined
at a molecular level. A relationship can be established
between a polymer's surface chemical (or morphological)
structure and its surface properties such as adhesion
and metallization.",
acknowledgement = ack-nhfb,
affiliation = "IBM Res. Div., Thomas J. Watson Res. Center",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Cu/int Cu/el",
classcodes = "A8160J (Surface treatment and degradation of polymers
and plastics); A8190 (Other topics in materials
science); A6820 (Solid surface structure); A6140K
(Structure of polymers, elastomers, and plastics);
A0130R (Reviews and tutorial papers; resource letters);
B0560 (Polymers and plastics (engineering materials
science)); B2550E (Surface treatment for semiconductor
devices); B2550F (Metallisation and interconnection
technology)",
classification = "A0130R (Reviews and tutorial papers; A6140K
(Structure of polymers, elastomers, and plastics);
A6820 (Solid surface structure); A8160J (Surface
treatment and degradation of polymers and plastics);
A8190 (Other topics in materials science); B0560
(Polymers and plastics (engineering materials
science)); B2550E (Surface treatment for semiconductor
devices); B2550F (Metallisation and interconnection
technology); resource letters)",
corpsource = "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; Adhesion enhancement; Cu; dielectric
polymers; Dielectric polymers; enhancement; Fluorinated
polyimides; fluorinated polyimides; metallisation;
metallization; Metallization; PCTFE/glass; PCTFE/glass
adhesion; polyimide/polyimide; Polyimide/polyimide;
polymer blends; polymer structure; polymers; reviews;
surface chemistry; Surface chemistry; Surface
modification; surface modification; surface
pretreatments; Surface pretreatments; surface
topography; surface treatment; wet-process
modifications; Wet-process modifications",
thesaurus = "Adhesion; Metallisation; Polymer blends; Polymer
structure; Polymers; Reviews; Surface topography;
Surface treatment",
treatment = "G General Review",
}
@Article{Hester:1994:PPP,
author = "P. D. Hester and W. J. Filip",
title = "Preface: {Power2} and {PowerPC} Architecture and
Implementation",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "490--491",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#one",
abstract = "During the four years since the RISC System\slash
6000* (RS\slash 6000) announcement in February of 1990,
IBM* has strengthened its product line with
microprocessor enhancements, increased memory capacity,
improved graphics, greatly expanded I/O adapters, and
new AIX* and compiler releases. In 1991, IBM began
planning for future RS\slash 6000 systems that would
span the range from small, battery-operated products to
very large supercomputers and mainframes. As the first
step toward achieving this ``palmtop to teraFLOPS''
goal with a single architecture, IBM investigated
further optimizations for the original POWER
Architecture*. This effort led to the creation of the
PowerPC* alliance (IBM Corporation, Motorola*, Inc.,
and Apple* Computer Corporation) and the definition of
the PowerPC Architecture*. Today, the single-chip
PowerPC 601* processor is the basis of IBM's entry
systems. A more aggressively superscalar version of the
original POWER processor, the multichip POWER2*
processor, is exploited in our current IBM high-end
RISC systems. As technology continues to advance,
PowerPC implementations will provide the basis for
high-performance 64-bit super servers. This special
issue of the IBM Journal of Research and Development
focuses on the POWER2 and PowerPC portions of IBM's
wide-ranging announcement in the Fall of 1993. The new
POWER2 processor nearly doubles the performance of the
earlier high-end models. The PowerPC 601 processor was
introduced in the RISC System\slash 6000 Model 250, the
first system in the industry to use the PowerPC
Architecture created by the strategic
IBM/Motorola/Apple alliance. These workstations
achieved industry-leading performance and
price/performance on virtually every industry-standard
benchmark, including SPECint92*, SPECfp92*, Linpack,
TPP, TPC-A*, and TPC-C*. Compared to the 1990
offerings, SPEC performance nearly quadrupled,
transaction performance improved by a factor of almost
five, maximum memory capacity quadrupled, and the
maximum disk capacity grew by an order of magnitude.
The POWER2 design exploits both multichip technology
and a larger die size to execute up to six instructions
(eight operations) per clock cycle. Many of the
higher-performance POWER2-based systems provide peak
execution rates in excess of a half billion operations
per second. The paper by White and Dhawan provides an
overview of the POWER2 design. Shippy and Griffith
describe the dual fixed-point unit design, the data
cache unit, and the storage control unit. Hicks, Fry,
and Harvey describe the dual floating-point unit
design. Barreh et al. describe hardware strategies to
minimize compare-branch penalties in the instruction
cache unit. Welbon et al. describe a POWER2 hardware
performance- monitoring facility which provides
execution characteristics that can identify
opportunities for application performance improvement.
This facility can also be used to gather information
crucial to future design decisions. Two performance
papers conclude the POWER2 portion of this issue.
Franklin et al. analyze some of the key POWER2 hardware
contributions to performance on the commercial
workloads. Agarwal, Gustavson, and Zubair relate their
experiences with optimizing the high-performance
Engineering/Scientific Subroutine Library (ESSL) for
the POWER2 implementation. While POWER2 and PowerPC
implementations provide the opportunity for
high-performance systems, optimizing software is also
key in delivering end-user performance. Blainey
describes aspects of the TOBEY compiler, with special
emphasis on instruction scheduling for the RS\slash
6000 products. Heisch describes TDPR, a prototype
version of FDPR, a program restructuring tool which
improves application performance by placing frequently
executed code blocks so as to minimize instruction
cache misses and branch penalties. IBM and the PowerPC
alliance are currently developing a family of five
PowerPC designs. IBM and Motorola designers at the
Somerset Design Center in Austin will optimize
single-chip implementations of the PowerPC Architecture
for high-volume products. The high-end requirements of
the large server and workstation products will be
addressed with multichip PowerPC implementations from
IBM. \par
IBM entry-level workstation products introduced the
PowerPC 601 microprocessor, the first member of the
PowerPC family. The goal for the PowerPC 601 designers
was to quickly bring PowerPC to the market. Vaden et
al. describe the microarchitecture and performance
aspects of the PowerPC 601 processor. Brodnax et al.
discuss the PowerPC 601 circuitry and chip
implementation details. Future products are planned
that will incorporate the PowerPC 603*, PowerPC 604*,
and the 64-bit PowerPC 620* implementations as they
become available. In addition, the price and
price/performance of the PowerPC family enable
lower-cost ``RISC PCs'' to be built using PowerPC
microprocessors. These ``RISC PCs'' will be developed
by the IBM POWER Personal Systems Division. \par
The PowerPC and POWER2 systems signify a major
milestone in IBM's commitment to the ``palmtops to
teraFLOPS'' strategy. The PowerPC 601 chip extends the
entry products further into the high-volume market by
providing exceptional performance in a low-cost
single-chip microprocessor. The high-end POWER2
implementation extracts the maximum performance
achievable in today's technology, thrusting the IBM
RISC processors into the supercomputing and
large-server environments. IBM POWER Parallel Systems
extends the RS\slash 6000 processing capability by
providing IBM POWER Parallel SP2* systems with up to
512 POWER/POWER2 nodes. In addition to scalability,
four-way High Availability Cluster Multi-Processor
(HACMP) systems provide the reliability/availability
that one would expect from mainframe-class systems by
supporting a ``no single point of failure'' capability,
even when one processor is off line. This impressive
base of processing technology complements a commitment
to high-performance compilers and strong graphics
offerings. \par
This robust product line addresses the cost-driven
requirements of the entry workstation market, the
transaction and server requirements of the commercial
market, and the computation-intensive requirements of
the technical market. These hardware offerings result
from a team effort by many dedicated and talented
individuals from around the world. Their expertise and
skill in a wide range of disciplines were key to
achieving this significant step toward the goal of a
comprehensive architecture. We want to thank all those
involved in continuing the success of the RISC
System\slash 6000 line.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{White:1994:PNG,
author = "S. W. White and S. Dhawan",
title = "{POWER2}: {Next} generation of the {RISC System\slash
6000} family",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "493--502",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#two",
abstract = "Since its announcement, the IBM RISC System\slash
6000* processor has characterized the aggressive
instruction-level parallelism approach to achieving
performance. Recent enhancements to the architecture
and implementation provide greater superscalar
capability. This paper describes the architectural
extensions which improve storage reference bandwidth,
allow hardware square-root computation, and speed
floating-point-to-integer conversion. The
implementation, which exploits these extensions and
doubles the number of functional units, is also
described. A comparison of performance results on a
variety of industry standard benchmarks demonstrates
that superscalar capabilities are an attractive
alternative to aggressive clock rates.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220P (Parallel architecture);
C5470 (Performance evaluation and testing)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220P (Parallel architecture);
C5470 (Performance evaluation and testing)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bandwidth; evaluation; floating-point-to-;
Floating-point-to-integer conversion;
Floating-point-to-integer conversion, POWER2; IBM RISC
System/6000 processor; IBM RISC System\slash 6000
processor; instruction-level; Instruction-level
parallelism; integer conversion; microprocessor chips;
parallel architectures; parallelism; performance;
POWER2; reduced instruction set computing; Square-root
computation; square-root computation; storage
reference; Storage reference bandwidth; superscalar
capability; Superscalar capability",
thesaurus = "Microprocessor chips; Parallel architectures;
Performance evaluation; Reduced instruction set
computing",
treatment = "P Practical",
}
@Article{Shippy:1994:PFD,
author = "D. J. Shippy and T. W. Griffith",
title = "{POWER2} fixed-point, data cache, and storage control
units",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "503--524",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#three",
abstract = "The POWER2* fixed-point, data cache, and storage
control units provide a tightly integrated subunit for
a second-generation high-performance superscalar RISC
processor. These functional units provide dual
fixed-point execution units and a large multiported
data cache, as well as high-performance interfaces to
memory, I/O, and the other execution units in the
processor. These units provide the following features:
dual fixed-point execution units, improved
fixed-point/floating-point synchronization, new
floating-point load and store quadword instructions,
improved address translation, improved fixed-point
multiply/divide, large multiported D-cache, increased
bandwidth into and out of the caches through wider data
buses, an improved external interrupt mechanism, and an
improved I/O DMA mechanism to support
multiple-streaming Micro Channels.*",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5470 (Performance evaluation
and testing); C5610S (System buses); C5320G
(Semiconductor storage)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5320G (Semiconductor storage);
C5470 (Performance evaluation and testing); C5610S
(System buses)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "address translation; Address translation; cache; cache
storage; data buses; Data buses; data cache; Data
cache; dual fixed-point; Dual fixed-point execution
units; execution units; external interrupt; External
interrupt mechanism; floating-; Floating-point;
mechanism; memory interface; Memory interface;
microprocessor chips; multiple-streaming micro
channels; Multiple-streaming micro channels;
multiported data; Multiported data cache; performance
evaluation; point; POWER2; reduced instruction set
computing; storage control units; Storage control
units; storage management; superscalar RISC processor;
Superscalar RISC processor; synchronisation;
synchronization; Synchronization; system buses",
thesaurus = "Cache storage; Microprocessor chips; Performance
evaluation; Reduced instruction set computing; Storage
management; Synchronisation; System buses",
treatment = "P Practical",
}
@Article{Hicks:1994:PFU,
author = "T. N. Hicks and R. E. Fry and P. E. Harvey",
title = "{POWER2} floating-point unit: {Architecture} and
implementation",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "525--536",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#four",
abstract = "The POWER2* floating-point unit (FPU) extends the
concept of the innovative multiply-add fused (MAF) ALU
of the RISC System\slash 6000* processor to provide a
floating-point unit that sets new standards, not only
for computation capability but for data throughput and
processor flexibility. The POWER2 FPU achieves a
performance (MFLOPS) rate never accomplished before by
a personal workstation machine by (1) integrating dual
generic MAF ALUs, (2) doubling the instruction
bandwidth and quadrupling the data bandwidth over that
of the POWER FPU, (3) adding support for additional
functions, and (4) using dynamic instruction scheduling
techniques to maximize instruction-level parallelism
not only among its own internal units but with the rest
of the CPU.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220P (Parallel architecture);
C5230 (Digital arithmetic methods)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5220P (Parallel architecture);
C5230 (Digital arithmetic methods)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architectures; bandwidth; computing; Data bandwidth;
data bandwidth; Dynamic instruction scheduling; dynamic
instruction scheduling; floating point arithmetic;
floating-point unit; Floating-point unit; instruction;
Instruction bandwidth; Instruction-level parallelism;
instruction-level parallelism; Instruction-level
parallelism, POWER2; microprocessor chips; multiply add
fused arithmetic logic unit; Multiply add fused
arithmetic logic unit; parallel; parallel processing;
POWER2; reduced instruction set; RISC System/6000
processor; RISC System\slash 6000 processor",
thesaurus = "Floating point arithmetic; Microprocessor chips;
Parallel architectures; Parallel processing; Reduced
instruction set computing",
treatment = "P Practical",
}
@Article{Barreh:1994:PIC,
author = "J. I. Barreh and R. T. Golla and L. B. Arimilli and P.
J. Jordan",
title = "{POWER2} instruction cache unit",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "537--544",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#five",
abstract = "This paper describes the instruction cache unit (ICU)
of the IBM POWER2 processor, with emphasis on
improvements over the original POWER ICU design. The
POWERS ICU incorporates a new compare-branch scheme
that minimizes processing time penalties, a second
branch processor, increased branch look-ahead
capability, and doubled instruction-fetch and
instruction-dispatch bandwidth.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5320G (Semiconductor
storage)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5320G (Semiconductor
storage)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "branch; Branch look-ahead capability; branch
processor; Branch processor; cache storage;
compare-branch scheme; Compare-branch scheme; IBM RISC
System/6000; IBM RISC System/6000 processor;
instruction cache unit; Instruction cache unit;
instruction sets; instruction-dispatch bandwidth;
Instruction-dispatch bandwidth; instruction-fetch
bandwidth; Instruction-fetch bandwidth; look-ahead
capability; microprocessor chips; POWER2; processor;
reduced instruction set computing",
thesaurus = "Cache storage; Instruction sets; Microprocessor chips;
Reduced instruction set computing",
treatment = "P Practical",
}
@Article{Welbon:1994:PPM,
author = "E. H. Welbon and C. C. Chan-Nui and D. J. Shippy and
D. A. Hicks",
title = "The {POWER2} performance monitor",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "545--554",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#six",
abstract = "The POWER2* performance monitor (``monitor'') provides
the detailed hardware measurements necessary to study
the hardware/software interactions of workloads
executed by the POWER2 processor. The monitor is
integrated into the processor and is fully software
accessible. Of interest is the ability of this monitor
to selectively measure specific software processes with
minimal perturbation of those processes.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5470 (Performance evaluation
and testing)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5470 (Performance evaluation
and testing)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "hardware measurements; Hardware measurements;
hardware/software interactions; Hardware/software
interactions; IBM RISC System/6000; IBM RISC
System/6000 processor; instruction set computing;
microprocessor chips; performance evaluation;
performance monitor; Performance monitor; POWER2;
processor; reduced",
thesaurus = "Microprocessor chips; Performance evaluation; Reduced
instruction set computing",
treatment = "T Theoretical or Mathematical",
}
@Article{Franklin:1994:CWP,
author = "M. T. Franklin and W. P. Alexander and R. Jauhari and
A. M. G. Maynard and B. R. Olszewski",
title = "Commercial workload performance in the {IBM POWER2
RISC System\slash 6000} processor",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "555--561",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#seven",
abstract = "We describe features of the POWER2* processor and
memory subsystem that enhance RISC System\slash 6000*
performance of commercial workloads. We explain the
performance characteristics of commercial workloads and
some of the common benchmarks used to measure them. Our
own analysis methods are also described.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5430 (Microcomputers); C6140B (Machine-oriented
languages); C5310 (Storage system design); C6120 (File
organisation); C5220 (Computer architecture); C5470
(Performance evaluation and testing)",
classification = "C5220 (Computer architecture); C5310 (Storage system
design); C5430 (Microcomputers); C5470 (Performance
evaluation and testing); C6120 (File organisation);
C6140B (Machine-oriented languages)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "benchmarks; Benchmarks; commercial workload
performance; Commercial workload performance; IBM
computers; IBM POWER2 RISC System/6000; IBM POWER2 RISC
System/6000 processor; memory architecture; memory
subsystem; Memory subsystem; performance
characteristics; Performance characteristics;
performance evaluation; processor; reduced instruction
set computing; RISC System/6000 performance",
thesaurus = "IBM computers; Memory architecture; Performance
evaluation; Reduced instruction set computing",
treatment = "P Practical; R Product Review",
}
@Article{Agarwal:1994:EFP,
author = "R. C. Agarwal and F. G. Gustavson and M. Zubair",
title = "Exploiting functional parallelism of {POWER2} to
design high-performance numerical algorithms",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "563--576",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#eight",
abstract = "We describe the algorithms and architecture approach
to produce high-performance codes for numerically
intensive computations. In this approach, for a given
computation, we design algorithms so that they perform
optimally when run on a target machine --- in this
case, the new POWER2* machines from the RS\slash 6000
family of RISC processors. The algorithmic features
that we emphasize are functional parallelism,
cache/register blocking, algorithmic prefetching, loop
unrolling, and algorithmic restructuring. The
architectural features of the POWER2 machine that we
describe and that lead to high performance are multiple
functional units, high bandwidth between registers,
cache, and memory, a large number of fixed- and
floating-point registers, and a large cache and TLB
(translation lookaside buffer). The paper gives two
examples that illustrate how the algorithms and
architectural features interplay to produce
high-performance codes. They are BLAS (basic linear
algebra subroutines) and narrow-band matrix routines.
These routines are included in ESSL (Engineering and
Scientific Subroutine Library); an overview of ESSL is
also given in this paper.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7310 (Mathematics computing); C5430 (Microcomputers);
C6140B (Machine-oriented languages); C6110P (Parallel
programming)",
classification = "C5430 (Microcomputers); C6110P (Parallel
programming); C6140B (Machine-oriented languages);
C7310 (Mathematics computing)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithmic; Algorithmic prefetching; algorithmic
restructuring; Algorithmic restructuring; algorithms;
and Scientific Subroutine Library; basic linear
algebra; Basic linear algebra subroutines; BLAS;
cache/register blocking; Cache/register blocking;
computations; Engineering; Engineering and Scientific
Subroutine Library; ESSL; floating-point registers;
Floating-point registers; functional parallelism;
Functional parallelism; high-performance codes;
High-performance codes; high-performance numerical;
High-performance numerical algorithms; IBM computers;
loop unrolling; Loop unrolling; mathematics computing;
multiple functional units; Multiple functional units;
narrow-band matrix routines; Narrow-band matrix
routines; numerically intensive; Numerically intensive
computations; parallel algorithms; POWER2 workstations;
prefetching; processors; reduced instruction set
computing; RISC; RISC processors; RS/6000 family;
software libraries; subroutines; translation lookaside
buffer; Translation lookaside buffer; workstations",
thesaurus = "IBM computers; Mathematics computing; Parallel
algorithms; Reduced instruction set computing; Software
libraries; Workstations",
treatment = "P Practical",
}
@Article{Blainey:1994:IST,
author = "R. J. Blainey",
title = "Instruction scheduling in the {TOBEY} compiler",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "577--593",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#nine",
abstract = "The high performance of pipelined, superscalar
processors such as the POWER2* and PowerPC* is achieved
in large part through the parallel execution of
instructions. This fine-grain parallelism cannot always
be achieved by the processor alone, but relies to some
extent on the ordering of the instructions in a
program. This dependence implies that optimizing
compilers for these processors must generate or
schedule the instructions in an order that maximizes
the possible parallelism. This paper describes the
parts of the TOBEY compiler which address the
instruction scheduling issue.",
acknowledgement = ack-nhfb,
affiliation = "IBM Canada Ltd., Toronto, Ont., Canada",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150C (Compilers, interpreters and other processors);
C6110P (Parallel programming); C5220P (Parallel
architecture)C5430 (Microcomputers)",
classification = "C5220P (Parallel architecture); C5430
(Microcomputers); C6110P (Parallel programming); C6150C
(Compilers, interpreters and other processors)",
corpsource = "IBM Canada Ltd., Toronto, Ont., Canada",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "fine-grain parallelism; Fine-grain parallelism; IBM
computers; instruction scheduling; Instruction
scheduling; optimising compilers; optimizing compilers;
Optimizing compilers; parallel execution; Parallel
execution; parallel programming; pipeline processing;
pipelined; Pipelined superscalar processors; POWER2;
PowerPC; scheduling; superscalar processors; TOBEY
compiler; workstations",
thesaurus = "IBM computers; Optimising compilers; Parallel
programming; Pipeline processing; Scheduling;
Workstations",
treatment = "P Practical",
}
@Article{Heisch:1994:TPR,
author = "R. R. Heisch",
title = "Trace-directed program restructuring for {AIX}
executables",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "595--603",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#ten",
abstract = "This paper presents the design and implementation of
trace-directed program restructuring (TDPR) for AIX*
executable programs. TDPR is the process of reordering
the instructions in an executable program, using an
actual execution profile (or instruction address trace)
for a selected workload, to improve utilization of the
existing hardware architecture. Generally, the
application of TDPR results in faster programs,
programs that use less real memory, or both. Previous
similar work regarding profile-guided or
feedback-directed program optimization has demonstrated
significant improvements for various architectures.
TDPR applies these concepts to AIX executable programs
at a global level (i.e., independent of procedure or
other structural boundaries) running on the POWER,
POWER2*, and PowerPC 601* machines and adds the
methodology to preserve correctness and debuggability
for reordered executables. Using the prototype tools
developed for this effort on a selection of both
user-level application programs and operating system
(kernel) code, improvements in execution time of up to
73\% and reduced instruction memory requirements of up
to 61\% were measured. The techniques used to
restructure AIX executables are discussed, and the
performance improvements and memory reductions measured
for several application programs are presented.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150G (Diagnostic, testing, debugging and evaluating
systems); C6150C (Compilers, interpreters and other
processors); C5430 (Microcomputers); C5220 (Computer
architecture); C6120 (File organisation)",
classification = "C5220 (Computer architecture); C5430
(Microcomputers); C6120 (File organisation); C6150C
(Compilers, interpreters and other processors); C6150G
(Diagnostic, testing, debugging and evaluating
systems)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AIX executables; architecture; correctness;
Correctness; debuggability; Debuggability; execution
profile; Execution profile; feedback-directed program
optimization; Feedback-directed program optimization;
global; Global level; hardware; Hardware architecture;
IBM computers; instruction address trace; Instruction
address trace; instruction memory requirements;
Instruction memory requirements; instruction sets;
kernel code; Kernel code; level; optimising compilers;
POWER; POWER2; PowerPC 601 machines; program
diagnostics; storage management; trace-directed program
restructuring; Trace-directed program restructuring;
user-level application programs; User-level application
programs; workstations",
thesaurus = "IBM computers; Instruction sets; Optimising compilers;
Program diagnostics; Storage management; Workstations",
treatment = "P Practical",
}
@Article{Vaden:1994:DCP,
author = "M. T. Vaden and L. J. Merkel and C. R. Moore and T. M.
Potter and R. J. Reese",
title = "Design considerations for the {PowerPC} 601
microprocessor",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "605--620",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#eleven",
abstract = "The PowerPC 601* microprocessor (601) is the first
member of a family of processors that support IBM's
PowerPC Architecture*. The 601 is a general-purpose
processor based on a superscalar design point. As with
any development effort, the 601 development program had
several different, often conflicting, design goals. The
most important requirements were support for the
PowerPC Architecture, a short development cycle,
competitive performance and cost, compatibility with
existing POWER applications, and support for
multiprocessing. This paper describes several aspects
of the 601 design and discusses some of the design
trade-offs considered in those areas.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C5430 (Microcomputers); C5440 (Multiprocessing
systems); C5220P (Parallel architecture)",
classification = "C5220P (Parallel architecture); C5430
(Microcomputers); C5440 (Multiprocessing systems)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "architectures; competitive performance; Competitive
performance; design considerations; Design
considerations; design point; general-purpose
processor; General-purpose processor; IBM; IBM
computers; IBM PowerPC Architecture; multiprocessing;
Multiprocessing; multiprocessing systems; parallel;
PowerPC 601 microprocessor; PowerPC Architecture;
superscalar; Superscalar design point; workstations",
thesaurus = "IBM computers; Multiprocessing systems; Parallel
architectures; Workstations",
treatment = "P Practical; R Product Review",
}
@Article{Brodnax:1994:IPM,
author = "T. B. Brodnax and R. V. Billings and S. C. Glenn and
P. T. Patel",
title = "Implementation of the {PowerPC} 601 microprocessor",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "621--632",
month = sep,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html#twelve",
abstract = "To produce a marketable PowerPC* microprocessor on a
short development schedule, the logic had to be
designed in a manner flexible enough to allow quick
modifications without sacrificing high performance and
density when customized cells were required. This was
accomplished for the PowerPC 601* microprocessor (601)
with a high-level design-language description, which
was synthesized for a gate-level implementation and
simulated for functional verification. In a similar
way, the physical design strategy for the 601 struck an
attractive balance between a highly automated, flexible
floorplan and the additional density that had to be
available for limited, well-conceived manual
placements. Finally, a rigorous test strategy was
implemented, which has proved very useful in analyzing
the processor and in assembling 601-based systems.
Careful adherence to this methodology led to a
successful first-pass physical implementation, leaving
the second iteration for additional customer
requests.",
acknowledgement = ack-nhfb,
affiliation = "IBM Corp., Austin, TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips)",
classification = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips)",
corpsource = "IBM Corp., Austin, TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "description; flexible floorplan; Flexible floorplan;
functional; Functional verification; gate-level
implementation; Gate-level implementation; high-level
design-language; High-level design-language
description; IBM computers; microprocessor chips;
PowerPC 601 microprocessor; rigorous test strategy;
Rigorous test strategy; verification",
thesaurus = "IBM computers; Microprocessor chips",
treatment = "P Practical",
}
@Article{Anonymous:1994:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "633--639",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Aug 29 08:42:18 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1994:RIPe,
author = "Anonymous",
title = "Recent {IBM} patents",
journal = j-IBM-JRD,
volume = "38",
number = "5",
pages = "641--648",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Dec 09 17:22:32 1995",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-5.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boudreau:1994:PCR,
author = "P. E. Boudreau and W. C. Bergman and D. R. Irvin",
title = "Performance of a cyclic redundancy check and its
interaction with a data scrambler",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "651--658",
month = nov,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html#one",
abstract = "This paper covers four topics: (1) the operation and
performance of cyclic redundancy checks (CRCs); (2) the
shortest error patterns of various weights that are
undetectable by the ANSI/IEEE-standard 32-bit CRC
(CRC32); (3) the general interaction of data scramblers
with CRCs; and (4) the specific problems that arise in
ATM communication due to the interaction of the
scrambler with the degree-10 CRC polynomial (CRC10).
Elaborating (4), we explore the virtues of replacing
CRC10 with CRC32 or with a degree-10 polynomial (P2055)
that has no factors in common with the scrambler.
Extensive results are presented concerning the
capability of CRC10, P2055, and CRC32 to detect various
error patterns.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6230 (Switching centres and equipment); B6150C
(Communication switching); B6120B (Codes); C5670
(Network performance); C5470 (Performance evaluation
and testing)",
classification = "B6120B (Codes); B6150C (Communication switching);
B6230 (Switching centres and equipment); C5470
(Performance evaluation and testing); C5670 (Network
performance)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ANSI; asynchronous transfer mode; ATM; ATM
communication; communication; cyclic codes; cyclic
redundancy check; Cyclic redundancy check; data
scrambler; Data scrambler; evaluation; IEEE-standard;
performance; Performance; shortest error patterns;
Shortest error patterns",
thesaurus = "Asynchronous transfer mode; Cyclic codes; Performance
evaluation",
treatment = "P Practical",
}
@Article{Deutsch:1994:PLE,
author = "A. Deutsch and G. Arjavalingam and C. W. Surovic and
A. P. Lanzetta and K. E. Fogel and F. Doany and M.
Ritter",
title = "Performance limits of electrical cables for
intrasystem communication",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "659--672",
month = nov,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html#two",
abstract = "Three types of cables (commercially available
high-performance coaxial and ribbon cables, and an
experimental flexible-film cable) were investigated for
intrasystem communication in high-performance computer
and communication systems. The electrical properties of
the cables and their respective connectors were
obtained and compared through the use of time-domain
techniques. Feasibility for use in digital signal
propagation at 500 Mb/s --- 1 Gb/s was demonstrated by
means of pulse propagation and eye-diagram
measurements. Performance limits in terms of maximum
useful cable lengths were determined through
simulations which included the effects of associated
connectors, vias, and printed-circuit-card wiring.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6240D (Waveguide and coaxial cable systems); B6210L
(Computer communications); C5620 (Computer networks and
techniques)",
classification = "B6210L (Computer communications); B6240D (Waveguide
and coaxial cable systems); C5620 (Computer networks
and techniques)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "coaxial cable; Coaxial cable; coaxial cables;
communication; computer networks; electrical cables;
Electrical cables; electrical properties; Electrical
properties; eye-diagram measurements; Eye-diagram
measurements; flexible-film cable; Flexible-film cable;
intrasystem; Intrasystem communication; performance
limits; Performance limits; printed-circuit-card;
Printed-circuit-card wiring; propagation; pulse; Pulse
propagation; time-domain techniques; Time-domain
techniques; wiring",
thesaurus = "Coaxial cables; Computer networks",
treatment = "P Practical",
}
@Article{Agarwal:1994:HMA,
author = "R. C. Agarwal and F. G. Gustavson and M. Zubair",
title = "A high-performance matrix-multiplication algorithm on
a distributed-memory parallel computer, using
overlapped communication",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "673--681",
month = nov,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html#three",
abstract = "In this paper, we propose a scheme for matrix-matrix
multiplication on a distributed-memory parallel
computer. The scheme hides almost all of the
communication cost with the computation and uses the
standard, optimized Level-3 BLAS operation on each
node. As a result, the overall performance of the
scheme is nearly equal to the performance of the
Level-3 optimized BLAS operation times the number of
nodes in the computer, which is the peak performance
obtainable for parallel BLAS. Another feature of our
algorithm is that it can give peak performance for
larger matrices, even if the underlying communication
network of the computer is slow.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C7310 (Mathematics computing); C5440 (Multiprocessing
systems); C4140 (Linear algebra); C5470 (Performance
evaluation and testing)",
classification = "C4140 (Linear algebra); C5440 (Multiprocessing
systems); C5470 (Performance evaluation and testing);
C7310 (Mathematics computing)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algebra; communication; Communication cost; cost;
distributed memory parallel computer; Distributed
memory parallel computer; distributed memory systems;
high-performance matrix-multiplication algorithm;
High-performance matrix-multiplication algorithm;
Level-3 BLAS operation; mathematics computing; matrix;
matrix-matrix multiplication; Matrix-matrix
multiplication; overlapped; Overlapped communication;
performance evaluation",
thesaurus = "Distributed memory systems; Mathematics computing;
Matrix algebra; Performance evaluation",
treatment = "A Application; P Practical",
}
@Article{Raghavan:1994:MVR,
author = "P. Raghavan and M. Snir",
title = "Memory versus randomization in on-line algorithms",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "683--707",
month = nov,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html#four",
abstract = "On-line algorithms service sequences of requests, one
at a time, without knowing future requests. We compare
their performance with the performance of algorithms
that generate the sequences and service them as well.
In many settings, on-line algorithms perform almost as
well as optimal off-line algorithms, by using
statistics about previous requests in the sequences.
Since remembering such information may be expensive, we
consider the use of randomization to eliminate memory.
In the process, we devise and study performance
measures for randomized on-line algorithms. We develop
and analyze memoryless randomized on-line algorithms
for the cacheing problem and its generalizations.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4240 (Programming and algorithm theory); C6120 (File
organisation)",
classification = "C4240 (Programming and algorithm theory); C6120
(File organisation)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "buffer circuits; cache storage; cacheing problem;
Cacheing problem; on-line algorithms; On-line
algorithms; optimal off-line algorithms; Optimal
off-line algorithms; performance; Performance;
randomised algorithms; randomization; Randomization;
sequences of requests; Sequences of requests",
thesaurus = "Buffer circuits; Cache storage; Randomised
algorithms",
treatment = "P Practical; T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:AIVa,
author = "Anonymous",
title = "Author index for Volume 37",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "??--??",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:AIVb,
author = "Anonymous",
title = "Author index for Volume 38",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "??--??",
month = jun,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:PRIa,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "??--??",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:PRIb,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "??--??",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:PRIc,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "??--??",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:PRId,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "??--??",
month = apr,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:PRIf,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "??--??",
month = jun,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RIPa,
author = "Anonymous",
title = "Recent {IBM} publications",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "??--??",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:43:09 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RIPc,
author = "Anonymous",
title = "Recent {IBM} publications",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "??--??",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:43:16 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RIPd,
author = "Anonymous",
title = "Recent {IBM} publications",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "??--??",
month = apr,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:43:20 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPb,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "38",
number = "3",
pages = "??--??",
month = mar,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPc,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "38",
number = "4",
pages = "??--??",
month = apr,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPe,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "??--??",
month = jun,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "??--??",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "38",
number = "2",
pages = "??--??",
month = feb,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "??--??",
month = jun,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:43:25 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:SIVa,
author = "Anonymous",
title = "Subject index for Volume 37",
journal = j-IBM-JRD,
volume = "38",
number = "1",
pages = "??--??",
month = jan,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-1.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1994:SIVb,
author = "Anonymous",
title = "Subject index for Volume 38",
journal = j-IBM-JRD,
volume = "38",
number = "6",
pages = "??--??",
month = jun,
year = "1994",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 26 08:59:30 MST 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Fleming:1995:PIC,
author = "Daniel J. Fleming",
title = "Preface: {IBM CMOS} Technology",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "3--3",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#one",
abstract = "Within the past decade CMOS has become the technology
of choice for a broad range of semiconductor products.
High-density DRAMs, high-speed processors, and
low-power devices for mobile applications are key
examples. Underlying this widespread appeal are the
distinguishing advantages that CMOS provides: an
exceptionally low power-delay product, the ability to
accommodate millions of devices on a single chip, and
flexible, custom design methodologies which permit
optimization, as required, for lowest cost, lowest
power, or highest speed. Accompanying the versatility
of CMOS is the economy of providing support for a
single technology, rather than for a collection of
several disparate ones. This issue of the IBM Journal
of Research and Development is a collection of papers
on IBM CMOS technology which illustrates this breadth
of application and describes the increasing
sophistication that is present in the underlying design
tools and fabrication techniques. The opening papers,
by Sechler and Grohoski, describe the impact of CMOS on
the system design of high-performance processors such
as those used in IBM's RISC System\slash 6000
workstation family. Following these are several papers
describing chip designs which together demonstrate the
flexibility of CMOS in providing superior solutions to
applications that traditionally required much more
disparate supporting device technology. Included are
contributions by Bernstein et al., describing the
trade-off of power for performance in the IBM 601
PowerPC chip, and two papers which show the versatility
of CMOS DRAM cores surrounded by application-specific
circuitry. The first, by Sunaga et al., is on a
wide-I/O (64Kb x 32) chip for graphics applications;
the second, by Ellis et al., demonstrates the
flexibility in DRAM applications that can be offered to
system designers. The use of CMOS in applications at
the interface between technically conflicting signal
regimes, such as photonics and analog, is illustrated
in the next three papers, by Kuchta et al. on CMOS
photodetector/preamplifiers, by Ewen et al. on
CMOS-based custom circuits for high-speed data
communication, and by Shin et al. on the design of a
custom low-power, high-performance CMOS-based digital
signal-processing circuit. Closing the section on chip
design are a paper by Bechade and Houle, which presents
a technique for clock multiplication, and a paper by
Dhong et al., which describes a circuit for providing a
low-noise CMOS TTL-compatible off-chip driver. Design
automation tools have had to keep pace with the
increasing complexity and diversity of CMOS
applications, as described in the next three papers.
Bose and Surya present techniques for a structured
approach to timing verification in high-speed RISC
processors. Bergamaschi et al. describe a now
commercially available method for synthesizing
gate-level networks from a high-level functional
description. Kuehlman et al. describe a formal
verification program for confirming the equivalence of
CMOS transistor-level designs and their high-level
functional specification. Today's CMOS technology is
the result of several decades of evolution, illustrated
by the papers in the final section. Adler et al.
describe the influence provided by DRAMs in this
evolutionary process. Chesebro et al. discuss the
complexity of channel-length control across large
chips, an effect which can seriously limit chip
performance. The next two papers speak to the current
state of the production art: Leonovich et al. describe
the process by which a modern silicon production
facility learns, and Koburger et al. describe how the
base technology provided by DRAMs is extended to
provide the features needed for high-performance,
low-power logic applications at 2.5 volts. Finally, the
extendibility of CMOS is examined in two papers which
explore the fringes of today's capabilities: Shahidi et
al. take a look at the implications of providing a CMOS
technology which operates at 1 volt, and Taur et al.
show results recently realized in fabricating CMOS
transistors at channel lengths of 100 nm and less.
\par
This issue was brought together by the diligent effort
of the following individuals: Peter Cottrell, James
Dunn, J. Michael Hancock, Tak Ning, Rosemary
Previti-Kelly, W. David Pricer, Robert Sechler, and
Lewis Terman, who identified and solicited the papers
as well as many of the peer reviewers. We are grateful
as well to Karen Papo, who provided invaluable and
responsive administrative support. Finally, we
acknowledge all those who make up the IBM CMOS
technology team. Their contributions are, of necessity,
only partially represented by the papers in this issue.
\par
Daniel J. Fleming Guest Editor \par
Editor's note: The editors gratefully acknowledge the
leadership of guest editor Daniel Fleming in the
planning and development of this issue. Formerly
Director of Development for the IBM Microelectronics
Division and now retired from IBM, Dan identified and
recruited the steering committee, organized the subject
matter as he has described it above, obtained the
commitment and support of executive management, and
provided direction, motivation, and encouragement to
all of us.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxpages = "3--4",
}
@Article{Sechler:1995:DAS,
author = "R. F. Sechler and G. F. Grohoski",
title = "Design at the system level with {VLSI CMOS}",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "5--22",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#two",
abstract = "This paper explores high-performance central
processing unit (CPU) design with VLSI CMOS.
Workstations are the focus, because they were first to
apply the synergism of CMOS, VLSI, and
reduced-instruction-set computing (RISC). But the
advances of CMOS now encompass all computing system
design, and extend to newly created environments. We
discuss CMOS extendibility in the highest-performance
areas.",
acknowledgement = ack-nhfb,
affiliation = "Syst. Technol. and Archit. Div., IBM Corp., Austin,
TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5130 (Microprocessor
chips); C5220 (Computer architecture)",
classification = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5130 (Microprocessor
chips); C5220 (Computer architecture)",
corpsource = "Syst. Technol. and Archit. Div., IBM Corp., Austin,
TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "CMOS digital integrated circuits; CMOS extendibility;
High-performance central processing unit;
high-performance central processing unit;
instruction-set computing; microprocessor chips;
reduced instruction set computing; reduced-;
Reduced-instruction-set computing; RISC; VLSI; VLSI
CMOS; workstations",
thesaurus = "CMOS digital integrated circuits; Microprocessor
chips; Reduced instruction set computing; VLSI;
Workstations",
treatment = "P Practical",
}
@Article{Sechler:1995:IDV,
author = "R. F. Sechler",
title = "Interconnect design with {VLSI CMOS}",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "23--31",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#three",
abstract = "Historically, high-performance logic circuit interchip
design has focused on bipolar emitter-coupled logic
(ECL) circuits and signals, but VLSI CMOS has attained
performance levels at which problems unique to its
characteristics must be addressed for design
optimization. In this paper, CMOS interchip circuit
models are applied to develop packaging and wiring
constraints for synchronous communication.",
acknowledgement = ack-nhfb,
affiliation = "Syst. Technol. and Archit. Div., IBM Corp., Austin,
TX, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B2570A (Integrated
circuit modelling and process simulation); B1265B
(Logic circuits); B0170J (Product packaging)",
classification = "B0170J (Product packaging); B1265B (Logic circuits);
B2570A (Integrated circuit modelling and process
simulation); B2570D (CMOS integrated circuits)",
corpsource = "Syst. Technol. and Archit. Div., IBM Corp., Austin,
TX, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "bipolar emitter-coupled logic; Bipolar emitter-coupled
logic circuits; circuit; circuits; CMOS interchip
circuit; CMOS interchip circuit models; CMOS logic
circuits; communication; Coupled lines; coupled lines;
Delays; delays; Design optimization; design
optimization; ECL; emitter-coupled logic;
high-performance logic; High-performance logic circuit;
integrated circuit design; integrated circuit
modelling; integrated circuit noise; integrated circuit
packaging; Interchip design; interchip design;
Interconnect design; interconnect design; models;
Noise; noise; Packaging; packaging; Reactive
reflections; reactive reflections; synchronous;
Synchronous communication; VLSI; VLSI CMOS; Wiring
constraints; wiring constraints",
thesaurus = "CMOS logic circuits; Delays; Emitter-coupled logic;
Integrated circuit design; Integrated circuit
modelling; Integrated circuit noise; Integrated circuit
packaging; VLSI",
treatment = "P Practical",
}
@Article{Bernstein:1995:RVP,
author = "K. Bernstein and J. E. Bertsch and L. G. Heller and E.
J. Nowak and F. R. White",
title = "Reduced voltage power\slash performance optimization
of the 3.6- volt {PowerPC} 601 microprocessor",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "33--42",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#four",
abstract = "An experimental 2.0-volt low-power PowerPC 601*
Microprocessor built in a modified 3.6-volt, 0.6-micron
IBM CMOS technology is described. By using unmodified
tasks from the 3.6-volt design, a 3x power savings was
realized while maintaining nearly the original
performance. The use of selective scaling provides high
performance at reduced power supply voltage. This
technique, applicable to selected existing product
designs, may allow early entry into the low-power
market while minimizing new process development
expense. The technique proposes hyperscaled reductions
in specific electrical and physical parameters, while
keeping horizontal layout rules unchanged. Static chip
designs, which comprise the majority of 601 circuitry,
respond well to the alterations. In addition, potential
reliability detractors are deuced or eliminated.
Challenges to this technique include I/O interfacing
and minimizing leakages associated with low device
thresholds. The 601 design and its base technology are
described, along with the experimental changes. The
paper reviews the motivation behind low-power
microprocessor development, alternative power-saving
techniques being practiced, and opportunities for
continued power reduction.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); B0170N (Reliability); C5130
(Microprocessor chips)",
classification = "B0170N (Reliability); B1265F (Microprocessors and
microcomputers); B2570D (CMOS integrated circuits);
C5130 (Microprocessor chips)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.6 mum; 0.6 Mum; 3.6 V; 601 design; 601 Design;
circuit optimisation; CMOS digital integrated circuits;
horizontal layout; Horizontal layout; hyperscaled
reductions; Hyperscaled reductions; IBM; integrated
circuit design; integrated circuit reliability;
integrated circuit technology; masks; microprocessor
chips; power savings; Power savings; reduced power;
Reduced power supply voltage; reliability; Reliability;
selective scaling; Selective scaling; static chip
design; Static chip design; supply voltage; unmodified;
Unmodified masks; voltage power/performance
optimization; Voltage power/performance optimization",
numericalindex = "Voltage 3.6E+00 V; Size 6.0E-07 m",
thesaurus = "Circuit optimisation; CMOS digital integrated
circuits; Integrated circuit design; Integrated circuit
reliability; Integrated circuit technology;
Microprocessor chips; Reliability",
treatment = "X Experimental; P Practical; R Product Review",
}
@Article{Sunaga:1995:DGA,
author = "T. Sunaga and K. Hosokawa and S. H. Dhong and K.
Kitamura",
title = "A {64Kb} $\times$ 32 {DRAM} for graphics
applications",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "43--50",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#five",
abstract = "A high-speed 2Mb CMOS DRAM with 32 data I/Os is
described. A 0.6-micron CMOS process with a single
polysilicon layer, two levels of metal, and
substrate-plate trench-capacitor (SPT) memory cells is
used to fabricate the chip. It is designed to provide
the wide data bandwidth required by high-performance
graphics applications. A 35-ns access time with an
80-ns cycle time has been demonstrated. The 32-bit data
bus and the high-speed feature achieve more than two
times better graphics performance than conventional
dual-port memories. A sensing method with a 2/3 VDD
bit-line precharge voltage and a limited bit-line
voltage swing is exploited to optimize speed and power.
The chip, which operates on a 5-V power supply,
dissipates 140 mA at the 80-ns cycle time.",
acknowledgement = ack-nhfb,
affiliation = "Yasu Technol. Application Lab., IBM Japan Ltd., Yasu,
Japan",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage); C5310
(Storage system design)C5540 (Terminals and graphic
displays)",
classification = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5310 (Storage system design); C5320G
(Semiconductor storage); C5540 (Terminals and graphic
displays)",
corpsource = "Yasu Technol. Application Lab., IBM Japan Ltd., Yasu,
Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "0.6 mum; 0.6 Mum; 140 mA; 140 MA; 32 bit; 32 Bit; 35
ns; 35 Ns; 5 V; 64 k; 64 K; bandwidth; chips; CMOS
DRAM; CMOS memory circuits; computer graphic equipment;
cycle time; Cycle time; DRAM; dual-port memories;
Dual-port memories; graphics; graphics applications;
Graphics applications; Graphics performance;
high-performance graphics; High-performance graphics;
integrated circuit technology; limited bit-; Limited
bit-line voltage; line voltage; memory architecture;
performance; polysilicon layer; Polysilicon layer;
sensing method; Sensing method; substrate-plate
trench-capacitor memory cells; Substrate-plate
trench-capacitor memory cells; wide data; Wide data
bandwidth",
numericalindex = "Memory size 6.6E+04 Byte; Word length 3.2E+01 bit;
Size 6.0E-07 m; Time 3.5E-08 s; Voltage 5.0E+00 V;
Current 1.4E-01 A",
thesaurus = "CMOS memory circuits; Computer graphic equipment; DRAM
chips; Integrated circuit technology; Memory
architecture",
treatment = "A Application; P Practical",
}
@Article{Ellis:1995:MDA,
author = "W. F. Ellis and J. E. {Barth, Jr.} and S. Divakaruni
and J. H. Dreibelbis and A. Furman and E. L. Hedberg
and H. S. Lee and T. M. Maffitt and C. P. Miller and C.
H. Stapper and H. L. Kalter",
title = "Multipurpose {DRAM} architecture for optimal power,
performance, and product flexibility",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "51--62",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#six",
abstract = "An 18 Mb DRAM has been designed in a 3.3-V, 0.5-$\mu$m
CMOS process. The array consists of four independent,
self-contained 4.5 Mb quadrants. The chip output
configuration defaults to 1 Mb $\times$ 18 for
optimization of wafer screen tests, while 3.3-V or
5.0-V operation is selected by choosing one of two M2
configurations. Selection of 2 Mb $\times$ 9 or 1 Mb
$\times$ 18 operation with the various address options,
in extended data-out or fast-page mode, is accomplished
by selective wire-bonding during module build. Laser
fuses enable yield enhancement by substituting eight
512 Kb array I/O slices for nine in each quadrant of
the 18 Mb array. This substitution is independent in
each quadrant and results in 1 Mb $\times$ 16 operation
with 2 Mb $\times$ 8, 4 Mb $\times$ 4, and 4 Mb
$\times$ 4 with any 4 Mb independently selectable (4 Mb
$\times$ 4 w/4 CE). Input and control circuitry are
designed such that performance margins are constant
across output and functional configurations. The
architecture also provides for `cut-downs' to 16 Mb,
4.5 Mb, and 4 Mb chips with I/O and function as
above.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5310 (Storage system design); C5320G
(Semiconductor storage)",
classification = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5310 (Storage system design); C5320G
(Semiconductor storage)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1 Mbit; 16 Mbit; 18 Bit; 18 bit; 18 Mbit; 2 Mbit; 3.4
V; 4 Bit; 4 bit; 4 Mbit; 4.5; 4.5 Mbit; 5 V; 9 Bit; 9
bit; chip output; Chip output configuration; CMOS
memory circuits; CMOS process; configuration;
configurations; Control circuitry; control circuitry;
DRAM chips; integrated circuit design; integrated
circuit technology; integrated circuit yield; M2; M2
configurations; Mbit; memory architecture; Multipurpose
DRAM architecture; multipurpose DRAM architecture;
Optimal power; optimal power; Optimization;
optimization; Performance; performance; Performance
margins; performance margins; Product flexibility;
product flexibility; Selective wire-bonding; selective
wire-bonding; Wafer screen tests; wafer screen tests;
Yield enhancement; yield enhancement",
numericalindex = "Storage capacity 1.9E+07 bit; Voltage 3.4E+00 V;
Voltage 5.0E+00 V; Storage capacity 2.1E+06 bit;
Storage capacity 1.0E+06 bit; Word length 9.0E+00 bit;
Word length 1.8E+01 bit; Storage capacity 4.2E+06 bit;
Word length 4.0E+00 bit; Storage capacity 1.7E+07 bit;
Storage capacity 4.7E+06 bit",
thesaurus = "CMOS memory circuits; DRAM chips; Integrated circuit
design; Integrated circuit technology; Integrated
circuit yield; Memory architecture",
treatment = "P Practical; X Experimental",
}
@Article{Kuchta:1995:PFD,
author = "D. M. Kuchta and H. A. Ainspan and F. J. Canora and R.
P. {Schneider, Jr.}",
title = "Performance of fiber-optic data links using 670-nm cw
{VCSELs} and a monolithic {Si} photodetector and {CMOS}
preamplifier",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "63--72",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#seven",
abstract = "To be competitive with copper technology for links and
bus applications, optoelectronics must be made
affordable. One means of achieving a low-cost
optoelectronics link is to adapt volume-manufactured
components. This may imply CMOS optoelectronic
integrated circuits (OEICs), which are suggested by the
huge CMOS IC volumes being produced for computer logic
and memory, and red laser diodes, which are already in
demand for the consumer and storage markets. In this
paper, we demonstrate a potential low-cost link using a
monolithically integrated Si photodiode and CMOS
preamplifier, a multimode fiber-optic transmission
medium, and red, vertical-cavity surface-emitting
lasers (VCSELs). The integrated receiver shows a 3.5-dB
improvement in received power when light at 670 nm
instead of 845 nm is used; it operates error free at
both the Fibre Channel rate of 531.25 Mb/s and the
SONET OC-12 rate of 622.08 Mb/s. The red VCSELs are
shown to be capable of a 1.5-Gb/s transmission data
rate with as little as 18 mW average power dissipation.
The potential for fabricating arrays using both of
these technologies for optical buses is discussed.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B6260 (Optical links and equipment); B2570D (CMOS
integrated circuits); B1220 (Amplifiers); B7230C
(Photodetectors); B4270 (Integrated optoelectronics);
B4320J (Semiconductor lasers); B4360 (Laser
applications)",
classification = "B1220 (Amplifiers); B2570D (CMOS integrated
circuits); B4270 (Integrated optoelectronics); B4320J
(Semiconductor lasers); B4360 (Laser applications);
B6260 (Optical links and equipment); B7230C
(Photodetectors)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1.5; 1.5 Gbit/s; 531.25 Mbit/s; 622.08 Mbit/s; 670 Nm;
670 nm; applications; Arrays; arrays; circuits; CMOS;
CMOS analogue integrated circuits; CMOS optoelectronic
integrated; CMOS optoelectronic integrated circuits;
CMOS preamplifier; data communication; equipment;
Fiber-optic data links; fiber-optic data links; Fibre
channel rate; fibre channel rate; Gbit/s; integrated;
integrated optoelectronics; Integrated receiver;
integrated Si photodiode; laser beam; low-cost;
Low-cost link; low-cost link; Low-cost optoelectronics
link; medium; monolithic integrated circuits;
Monolithic Si photodetector; monolithic Si
photodetector; monolithically; Monolithically
integrated Si photodiode; multimode fiber-optic
transmission; Multimode fiber-optic transmission
medium; Optical buses; optical buses; optical links;
optical receivers; optoelectronics link;
photodetectors; preamplifier; preamplifiers; receiver;
Red laser diodes; red laser diodes; semiconductor
lasers; Si; SONET OC-12 rate; surface emitting lasers;
Vertical-cavity surface-emitting lasers;
vertical-cavity surface-emitting lasers;
Volume-manufactured components; volume-manufactured
components",
numericalindex = "Wavelength 6.7E-07 m; Bit rate 5.3125E+08 bit/s; Bit
rate 6.2208E+08 bit/s; Bit rate 1.5E+09 bit/s",
thesaurus = "CMOS analogue integrated circuits; Data communication
equipment; Integrated optoelectronics; Laser beam
applications; Monolithic integrated circuits; Optical
links; Optical receivers; Photodetectors;
Preamplifiers; Semiconductor lasers; Surface emitting
lasers",
treatment = "P Practical",
}
@Article{Ewen:1995:CCG,
author = "J. F. Ewen and M. Soyuer and A. X. Widmer and K. R.
Wrenner and B. D. Parker and H. A. Ainspan",
title = "{CMOS} circuits for {Gb/s} serial data communication",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "73--81",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#eight",
abstract = "The functional characteristics and design challenges
associated with a variety of communication-related
circuits are presented. These include the mixed-signal
design and noise issues associated with high-speed
clock generation and recovery for serial data
communication. Hardware results are presented on the
noise properties of common integrated
voltage-controlled oscillator (VCO) circuits.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1280 (Mixed analogue-digital circuits); B2570D (CMOS
integrated circuits); B6210 (Telecommunication
applications); B1230B (Oscillators); B1250 (Modulators,
demodulators, discriminators and mixers)",
classification = "B1230B (Oscillators); B1250 (Modulators,
demodulators, discriminators and mixers); B1280 (Mixed
analogue-digital circuits); B2570D (CMOS integrated
circuits); B6210 (Telecommunication applications)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuit noise; circuits; clock generation; clocks;
CMOS circuits; CMOS integrated circuits; common
integrated voltage-; Common integrated
voltage-controlled oscillator; communication equipment;
communication-; Communication-related circuits;
controlled oscillator; data; frequency synthesizer PLL;
Frequency synthesizer PLL; Gb/s serial data
communication; high-speed; High-speed clock generation;
mixed analogue-digital integrated; mixed-signal design;
Mixed-signal design; noise; Noise; phase locked loops;
recovery; Recovery; related circuits;
voltage-controlled oscillators",
thesaurus = "Circuit noise; Clocks; CMOS integrated circuits; Data
communication equipment; Mixed analogue-digital
integrated circuits; Phase locked loops;
Voltage-controlled oscillators",
treatment = "P Practical",
}
@Article{Shin:1995:CDC,
author = "H. J. Shin and D. J. Pearson and S. K. Reynolds and A.
C. Megdanis and S. Gowda and K. R. Wrenner",
title = "Custom design of {CMOS} low-power high-performance
digital signal-processing macro for hard-disk-drive
applications",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "83--91",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#nine",
abstract = "The design challenges and custom design techniques
associated with low-power, small-area, high-performance
CMOS digital signal-processing circuits for
hard-disk-drive applications are presented. The
advantages of custom design are demonstrated by an
example custom digital FIR filter macro that provides
substantial improvement in performance, area, and power
dissipation over standard-cell implementations.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1265F
(Microprocessors and microcomputers); B1270F (Digital
filters); C5320C (Storage on moving magnetic media);
C5135 (Digital signal processing chips); C5240 (Digital
filters)",
classification = "B1265F (Microprocessors and microcomputers); B1270F
(Digital filters); B2570D (CMOS integrated circuits);
C5135 (Digital signal processing chips); C5240 (Digital
filters); C5320C (Storage on moving magnetic media)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chips; CMOS digital integrated circuits; CMOS digital
signal-processing circuits; Custom design; custom
design; Custom digital FIR filter macro; custom digital
FIR filter macro; digital signal processing;
dissipation; FIR filters; hard discs; Hard disk drive;
hard disk drive; power; Power dissipation;
Standard-cell implementations; standard-cell
implementations",
thesaurus = "CMOS digital integrated circuits; Digital signal
processing chips; FIR filters; Hard discs",
treatment = "A Application; P Practical",
}
@Article{Bechade:1995:DDL,
author = "R. A. Bechade and R. M. Houle",
title = "Digital delay line clock shapers and multipliers",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "93--103",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#ten",
abstract = "Two digital techniques have been developed to generate
an internal clock signal from an external reference
clock supplied to a microprocessor. The first method
constitutes a clock shaper circuit that produces an
output clock that has a 50\% duty cycle regardless of
the duty cycle of the input reference clock. The second
technique generates an internal clock that is an N/2
multiple of the frequency of the input clock, where N
is an integer greater than 1. Both methods are entirely
digital and are independent of process and temperature
variations. Their accuracy limits are determined by the
technology. Both circuits are described and their
results compared.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265Z (Other digital circuits); B7220 (Signal
processing and conditioning equipment and techniques);
C5150 (Other circuits for digital computers); C5260
(Digital signal processing)",
classification = "B1265Z (Other digital circuits); B7220 (Signal
processing and conditioning equipment and techniques);
C5150 (Other circuits for digital computers); C5260
(Digital signal processing)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Accuracy limits; accuracy limits; clock signal;
clocks; delay lines; Digital delay line clock shapers;
digital delay line clock shapers; digital integrated
circuits; External reference clock; external reference
clock; internal; Internal clock signal; Microprocessor;
microprocessor; Multipliers; multipliers; multiplying
circuits; processing equipment; pulse shaping circuits;
signal",
thesaurus = "Clocks; Delay lines; Digital integrated circuits;
Multiplying circuits; Pulse shaping circuits; Signal
processing equipment",
treatment = "P Practical; X Experimental",
}
@Article{Dhong:1995:LTC,
author = "S. H. Dhong and M. Tanaka and S. W. Tomashot and T.
Kirihata",
title = "A low-noise {TTL}-compatible {CMOS} off-chip driver
circuit",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "105--112",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#eleven",
abstract = "Low-noise TTL-compatible off-chip driver (OCD)
circuits are very important, especially for low-power
electronics, but scaled-down CMOS technology requires a
lower operating voltage of 3.3 V, while most
applications require 5 V. The dual power-supply
requirement makes the design of OCD challenging, first
because pull-up devices, especially p-MOS devices, must
be able to handle an off-chip voltage of 5.6 V, which
is higher than an on-chip V$_{DD}$ of 2.8 V, and second
because pull-down devices should be able to discharge a
capacitive load of 5.6 V while operating at a minimum
on-chip V$_{DD}$ of 2.8 V. This extreme difference in
operating voltage makes the circuits susceptible to
ringing and performance degradation due to hot-electron
effects. In this paper, we describe a low-noise OCD
which has been successfully used in IBM
second-generation 4 Mb low-power DRAM (LPDRAM) and in
other products. For pull-ups, two stacked p-MOS devices
with floating n-wells are used, but they are operated
in different modes depending on the supply voltage. The
pull-down devices are basically composed of two stages,
one of which is in the diode configuration with its
gate and drain shorted together during the pull-down.
Detailed circuit designs to achieve low noise while
meeting the performance requirements are described.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1210 (Power electronics, supply and supervisory
circuits); B2570D (CMOS integrated circuits); B1265D
(Memory circuits); C5150 (Other circuits for digital
computers); C5320G (Semiconductor storage)",
classification = "B1210 (Power electronics, supply and supervisory
circuits); B1265D (Memory circuits); B2570D (CMOS
integrated circuits); C5150 (Other circuits for digital
computers); C5320G (Semiconductor storage)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2.8 V; 3.3 V; 4 Mb low-power DRAM; 5; 5 V; 5.6 V;
Capacitive load; capacitive load; CMOS integrated
circuits; Diode configuration; diode configuration;
DRAM chips; driver circuits; Dual power-supply; dual
power-supply; electronics; Floating n-wells; floating
n-wells; generation DRAM; Hot-electron effects;
hot-electron effects; IBM second-; IBM
second-generation DRAM; Low noise; low noise;
low-power; Low-power electronics; P-MOS devices; p-MOS
devices; Performance degradation; performance
degradation; Pull-up devices; pull-up devices; Ringing;
ringing; Scaled-down CMOS technology; scaled-down CMOS
technology; Stacked p-MOS devices; stacked p-MOS
devices; TTL-compatible CMOS off-chip driver circuit;
V",
numericalindex = "Voltage 3.3E+00 V; Voltage 5.0E+00 V; Voltage
5.6E+00 V; Voltage 2.8E+00 V",
thesaurus = "CMOS integrated circuits; DRAM chips; Driver
circuits",
treatment = "A Application; P Practical",
xxauthor = "S. H. Dhong and M. Tanaka and S. W. Tomashot and K.
Kirihata",
}
@Article{Bose:1995:ATV,
author = "P. Bose and S. Surya",
title = "Architectural timing verification of {CMOS RISC}
processors",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "113--129",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#twelve",
abstract = "We consider the problem of verification and testing of
architectural timing models (``timers'') coded to
predict cycles-per-instruction (CPI) performance of
advanced CMOS superscalar (RISC) processors. Such
timers are used for pre-hardware performance analysis
and prediction. As such, these software models play a
vital role in processor performance tuning as well as
application-based competitive analysis, years before
actual product availability. One of the key problems
facing a designer, modeler, or application analyst who
uses such a tool is to understand how accurate the
model is, in terms of the actual design. In contrast to
functional simulators, there is no direct way of
testing timers in the classical sense, since the
``correct'' execution time (in cycles) of a program on
the machine model under test is not directly known or
computable from equations, truth tables, or other
formal specifications. Ultimate validation (or
invalidation) of such models can be achieved under
actual hardware availability, by direct comparisons
against measured performance. However, deferring
validation solely to that stage would do little to
achieve the overall purpose of accurate pre-hardware
analysis, tuning, and projection. We describe a
multilevel validation method which has been used
successfully to transform evolving timers into highly
accurate pre-hardware models. In this paper, we focus
primarily on the following aspects of the methodology:
(a) establishment of cause-effect relationships in
terms of model defects and the associated fault
signatures; (b) derivation of application-based test
loop kernels to verify steady-state (periodic) behavior
of pipeline flow, against analytically predicted
signatures; and (c) derivation of synthetic test cases
to verify the ``core'' parameters characterizing the
pipeline-level machine organization as implemented in
the timer model. The basic tenets of the theory and its
application are described in the context of an example
processor, comparable in complexity to an advanced
member of the PowerPC* 6XX processor family.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5440 (Multiprocessing
systems); C6150G (Diagnostic, testing, debugging and
evaluating systems); C5220P (Parallel architecture);
C5470 (Performance evaluation and testing); C5210B
(Computer-aided logic design)",
classification = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5210B (Computer-aided
logic design); C5220P (Parallel architecture); C5440
(Multiprocessing systems); C5470 (Performance
evaluation and testing); C6150G (Diagnostic, testing,
debugging and evaluating systems)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytically predicted signatures; analytically
predicted signatures; Application-based competitive
analysis; application-based competitive analysis;
application-based test loop; Application-based test
loop kernels; architectural; Architectural timing
models; CAD; Cause-effect relationships; cause-effect
relationships; CMOS; CMOS digital integrated circuits;
CMOS RISC processor; CMOS superscalar processors;
computer testing; Cycles-per-instruction performance;
cycles-per-instruction performance; Execution time;
execution time; Fault signatures; fault signatures;
kernels; logic; microprocessor chips; Model defects;
model defects; multilevel; Multilevel validation;
Performance analysis; performance analysis; performance
evaluation; pipeline; Pipeline flow; pipeline flow;
Pipeline-level machine organization; pipeline-level
machine organization; PowerPC 6XX processor family;
Pre-hardware models; pre-hardware models; Prediction;
prediction; processing; reduced instruction set
computing; Software models; software models;
superscalar processors; Synthetic test cases; synthetic
test cases; Testing; testing; timing models;
validation; Verification; verification",
thesaurus = "CMOS digital integrated circuits; Computer testing;
Logic CAD; Microprocessor chips; Performance
evaluation; Pipeline processing; Reduced instruction
set computing",
treatment = "P Practical; X Experimental",
}
@Article{Bergamaschi:1995:HSI,
author = "R. A. Bergamaschi and R. A. O'Connor and L. Stok and
M. Z. Moricz and S. Prakash and A. Kuehlmann and D. S.
Rao",
title = "High-level synthesis in an industrial environment",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "131--148",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#thirteen",
abstract = "The use of modern hardware-description languages in
the chip design process has allowed designs to be
modeled at higher abstraction levels. More powerful
modeling styles, such as register-transfer and
behavioral level specifications, have spurred the
development of high-level synthesis techniques in both
industry and academia. However, despite the many
research efforts, the technology is not yet in
widespread use in industry. This paper presents the IBM
High-Level Synthesis System (HIS), which is the first
such system to be used in production in IBM. HIS
synthesizes gate-level networks from VHDL models at
various levels of abstraction. The main algorithms,
modeling capabilities, and methodology considerations
in the HIS system are presented. Results show that HIS
is capable of producing implementations comparable to
or better than those of the existing methodology, while
shortening the design time significantly. The HIS
system is currently in production use and evaluation in
several IBM sites for processors and peripheral chip
designs, as well as being an external commercial
product.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B2570 (Semiconductor integrated circuits); B1265B
(Logic circuits); C7410D (Electronic engineering
computing); C5210B (Computer-aided logic design);
C6140D (High level languages)",
classification = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); B2570 (Semiconductor
integrated circuits); C5210B (Computer-aided logic
design); C6140D (High level languages); C7410D
(Electronic engineering computing)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Behavioral level specifications; behavioral level
specifications; Chip design process; chip design
process; description languages; gate-level; Gate-level
networks; hardware description languages; hardware-;
Hardware-description languages; Hgh-level synthesis;
hgh-level synthesis; high level synthesis; IBM;
Industrial environment; industrial environment;
integrated circuit design; integrated logic circuits;
networks; register-; Register-transfer; transfer; VHDL
models",
thesaurus = "Hardware description languages; High level synthesis;
Integrated circuit design; Integrated logic circuits",
treatment = "P Practical",
}
@Article{Kuehlmann:1995:VFV,
author = "A. Kuehlmann and A. Srinivasan and D. P. LaPotin",
title = "{Verity} --- a formal verification program for
custom {CMOS} circuits",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "149--165",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#fourteen",
abstract = "In an effort to fully exploit CMOS performance, custom
design techniques are used extensively in commercial
microprocessor design. However, given the complexity of
current-generation processors and the necessity for
manual designer intervention throughout the design
process, proving design correctness is a major concern.
In this paper we discuss Verity, a formal verification
program for symbolically proving the equivalence
between a high-level design specification and MOS
transistor-level implementation. Verity applies
efficient logic comparison techniques which implicitly
exercise the behavior for all possible input patterns.
For a given register-transfer level (RTL) system model,
which is commonly used in present-day methodologies,
Verity validates the transistor implementation with
respect to functional simulation and verification
performed at the RTL level.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1130B
(Computer-aided circuit analysis and design); B1265
(Digital electronics); C7410D (Electronic engineering
computing); C5210B (Computer-aided logic design);
C6110F (Formal methods)",
classification = "B1130B (Computer-aided circuit analysis and design);
B1265 (Digital electronics); B2570D (CMOS integrated
circuits); C5210B (Computer-aided logic design); C6110F
(Formal methods); C7410D (Electronic engineering
computing)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "CMOS; CMOS digital integrated circuits; CMOS
performance; commercial microprocessor; Commercial
microprocessor design; comparison; custom CMOS
circuits; Custom CMOS circuits; custom design; Custom
design; design; equivalence; Equivalence; formal
verification; formal verification program; Formal
verification program; functional simulation; Functional
simulation; high; high-level design; High-level design
specification; level synthesis; logic; Logic
comparison; MOS transistor-level implementation;
performance; register-transfer level; Register-transfer
level; specification; verification; Verification;
Verity",
thesaurus = "CMOS digital integrated circuits; Formal verification;
High level synthesis",
treatment = "P Practical; R Product Review",
}
@Article{Adler:1995:EIC,
author = "E. Adler and J. K. DeBrosse and S. F. Geissler and S.
J. Holmes and M. D. Jaffe and J. B. Johnson and C. W.
{Koburger III} and J. B. Lasky and B. Lloyd and G. L.
Miles and J. S. Nakos and W. P. {Noble, Jr.} and S. H.
Voldman and M. Armacost and R. Ferguson",
title = "The evolution of {IBM CMOS DRAM} technology",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "167--188",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#fifteen",
abstract = "The development of DRAM at IBM produced many novel
processes and sophisticated analysis methods.
Improvements in lithography and innovative process
features reduced the cell size by a factor of 18.8 in
the time between the 4 Mb and 256 Mb generations. The
original substrate plate trench cell used in the 4 Mb
chip is still the basis of the 256 Mb technology being
developed today. This paper describes some of the more
important and interesting innovations introduced in IBM
CMOS DRAMs. Among them, shallow-trench isolation,
I-line and deep-UV (DUV) lithography, titanium
salicidation, tungsten stud contacts, retrograde
n-well, and planarized back-end-of-line (BEOL)
technology are core elements of current
state-of-the-art logic technology described in other
papers in this issue. The DRAM specific features
described are borderless contacts, the trench
capacitor, trench-isolated cell devices, and the
`strap'. Finally, the methods for study and control of
leakage mechanisms which degrade DRAM retention time
are described.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1265D (Memory
circuits); C5320G (Semiconductor storage)",
classification = "B1265D (Memory circuits); B2570D (CMOS integrated
circuits); C5320G (Semiconductor storage)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "256 Mbit; borderless contacts; Borderless contacts;
CMOS memory circuits; degradation; devices; DRAM chips;
ep-UV; Ep-UV lithography; I-line; IBM CMOS DRAM
technology; integrated circuit; isolation technology;
leakage currents; leakage mechanisms; Leakage
mechanisms; lithography; Lithography; photolithography;
planarized back-end-of-line technology; Planarized
back-end-of-line technology; retention time; Retention
time degradation; retrograde n-well; Retrograde n-well;
shallow-trench isolation; Shallow-trench isolation;
strap; Strap; substrate plate; Substrate plate trench
cell; technology; Ti salicidation; trench capacitor;
Trench capacitor; trench cell; trench-isolated cell;
Trench-isolated cell devices; tungsten stud contacts;
Tungsten stud contacts",
numericalindex = "Storage capacity 2.68E+08 bit",
thesaurus = "CMOS memory circuits; DRAM chips; Integrated circuit
technology; Isolation technology; Leakage currents;
Photolithography",
treatment = "P Practical",
}
@Article{Chesebro:1995:OGL,
author = "D. G. Chesebro and J. W. Adkisson and L. R. Clark and
S. N. Eslinger and M. A. Faucher and S. J. Holmes and
R. P. Mallette and E. J. Nowak and E. W. Sengle and S.
H. Voldman and T. W. Weeks",
title = "Overview of gate linewidth control in the manufacture
of {CMOS} logic chips",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "189--200",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#sixteen",
abstract = "This paper is an overview of the methods used at the
Burlington facility of the IBM Microelectronics
Division to improve channel-length tolerance control in
the manufacture of CMOS logic chips. We cover aspects
of (1) the impact of channel-length control on chip
performance, yield, and reliability; (2) our use of an
electrical linewidth monitor which permits high-volume,
accurate measurements to quantify polysilicon gate
linewidth variability and its improvements; and (3) our
efforts to reduce photolithographic and etching
contributions to the linewidth variability.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B2570D (CMOS integrated circuits); B1265B (Logic
circuits); B0170N (Reliability); B2550G (Lithography);
B2550E (Surface treatment for semiconductor devices)",
classification = "B0170N (Reliability); B1265B (Logic circuits);
B2550E (Surface treatment for semiconductor devices);
B2550G (Lithography); B2570D (CMOS integrated
circuits)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Burlington; Burlington facility; channel length;
Channel length tolerance control; Channel-length
control; channel-length control; chip; Chip
performance; CMOS logic chips; CMOS logic circuits;
electrical linewidth; Electrical linewidth monitor;
elemental semiconductors; Etching; etching; facility;
Gate linewidth control; gate linewidth control; IBM
Microelectronics Division; integrated circuit;
integrated circuit manufacture; integrated circuit
yield; Manufacture; manufacture; monitor; performance;
Photolithography; photolithography; Polysilicon gate
linewidth variability; polysilicon gate linewidth
variability; Reliability; reliability; Si; silicon;
tolerance control; VLSI; Yield; yield",
thesaurus = "CMOS logic circuits; Elemental semiconductors;
Etching; Integrated circuit manufacture; Integrated
circuit reliability; Integrated circuit yield;
Photolithography; Silicon; VLSI",
treatment = "P Practical",
}
@Article{Leonovich:1995:ICP,
author = "G. A. Leonovich and A. P. Ranchino and W. J. Miller
and U. E. Tsou",
title = "Integrated cost and productivity learning in {CMOS}
semiconductor manufacturing",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "201--213",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#seventeen",
abstract = "This paper describes a cost and productivity learning
process that was carried out on a large-capacity CMOS
manufacturing line at the IBM Burlington facility from
1991 to 1993. Major productivity gains were realized
through process and tool improvements affecting yield,
and through work-in-progress optimization and scrap
reduction. Significant cost learning was also
accomplished through tool cost management, capital
depreciation and space cost reductions, and manpower
optimization.",
acknowledgement = ack-nhfb,
affiliation = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1265 (Digital
electronics); B0170E (Production facilities and
engineering); B0170N (Reliability); B0140
(Administration and management)",
classification = "714.2; 722.1; 722.4; 911; 912.2; 913.1; B0140
(Administration and management); B0170E (Production
facilities and engineering); B0170N (Reliability);
B1265 (Digital electronics); B2570D (CMOS integrated
circuits)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Burlington facility; capital; Capital depreciation;
circuit manufacture; CMOS digital integrated circuits;
CMOS integrated circuits; CMOS semiconductor
manufacture; CMOS semiconductor manufacturing; cost;
Cost; cost learning; Cost learning; Costs;
depreciation; economics; Electronics industry; IBM; IBM
Burlington facility; integrated; integrated circuit
yield; Management; manpower optimization; Manpower
optimization; Manpower optimization, Integrated circuit
manufacture; Microcomputers; productivity;
Productivity; Random access storage; reduction; scrap;
Scrap reduction; space cost reduction; Space cost
reduction; tool cost management; Tool cost management;
Work in progress optimization; work-in-progress
optimization; Work-in-progress optimization",
thesaurus = "CMOS digital integrated circuits; Economics;
Integrated circuit manufacture; Integrated circuit
yield",
treatment = "P Practical",
xxauthor = "G. A. Leonovich and A. P. Franchino and W. J. Miller
and U. E. Tsou",
}
@Article{Koburger:1995:HCL,
author = "C. W. {Koburger III} and W. F. Clark and J. W.
Adkisson and E. Adler and P. E. Bakeman and A. S.
Bergendahl and A. B. Botula and W. Chang and B. Davari
and J. H. Givens and H. H. Hansen and S. J. Holmes and
D. V. Horak and C. H. Lam and J. B. Lasky and S. E.
Luce and R. W. Mann and G. L. Miles and J. S. Nakos and
E. J. Nowak and G. Shahidi and Y. Taur and F. R. White
and M. R. Wordeman",
title = "A half-micron {CMOS} logic generation",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "215--227",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#eighteen",
abstract = "During the early 1990s, half-micron lithography was
demonstrated in 16 Mb DRAM fabrication. Utilization of
this capability for CMOS logic devices within IBM
followed with a trio of programs, each with different
performance, density, feature list, and schedule. The
first version melded 3.3/3.6-V 16 Mb DRAM MOSFET
devices with an improved version of an existing dense,
planar, reliable multilevel back-end-of-line (BEOL)
metallization and wiring technology. Since it was built
directly from existing technologies, it was released
quite quickly. A 3.3-V follow-on technology was added
several months later. This logic offering added a local
interconnect and a faster device. A second follow-on
achieved greater speed improvement, calling upon a
2.5-V power supply and very tight channel-length
control to obtain performances 50\% above previous
generation standards, at lower power.",
acknowledgement = ack-nhfb,
affiliation = "IBM Microelectron. Div., IBM Corp.",
affiliationaddress = "Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1265D (Memory
circuits); B2550F (Metallisation and interconnection
technology); B2550G (Lithography)",
classification = "704.2; 714.2; 721.2; 722.1; 731.3; B1265D (Memory
circuits); B2550F (Metallisation and interconnection
technology); B2550G (Lithography); B2570D (CMOS
integrated circuits)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "16; 16 Mbit; 2.5 V; 2.5 V, Logic devices; 3.3 V; 3.6
V; Back end of line metallization; back-end-of-line
metallization; Channel length control; channel-length
control; Channel-length control; CMOS integrated
circuits; CMOS logic circuits; DRAM chips; DRAM
fabrication; DRAM MOSFET devices; Electric variables
control; Electric wiring; Fabrication; Half micron CMOS
logic generation; Half micron lithography; half-micron
CMOS logic generation; Half-micron CMOS logic
generation; half-micron lithography; Half-micron
lithography; improvement; integrated circuit;
integrated circuit metallisation; integrated circuit
technology; Interconnection technology;
interconnections; lithography; Lithography; local
interconnect; Local interconnect; Mbit; MOSFET devices;
precision resistor; Precision resistor; Random access
storage; reliable multilevel; Reliable multilevel
back-end-of-line metallization; speed; Speed
improvement; Technology",
numericalindex = "Storage capacity 1.7E+07 bit; Voltage 3.3E+00 V;
Voltage 3.6E+00 V; Voltage 2.5E+00 V",
thesaurus = "CMOS logic circuits; DRAM chips; Integrated circuit
interconnections; Integrated circuit metallisation;
Integrated circuit technology; Lithography",
treatment = "P Practical; X Experimental",
}
@Article{Shahidi:1995:CSM,
author = "G. G. Shahidi and J. D. Warnock and S. Comfort and S.
Fischer and P. A. McFarland and A. Acovic and T. I.
Chappell and B. A. Chappell and T. H. Ning and C. J.
Anderson and R. H. Dennard and J. Y.-C. Sun and M. R.
Polcari and B. Davari",
title = "{CMOS} scaling in the 0.1-$\mu$m, 1.{X}-volt regime
for high performance applications",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "229--244",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#nineteen",
abstract = "Deep-submicron CMOS is the primary technology for ULSI
systems. Currently, the state-of-the-art CMOS device
has a 0.25-$\mu$m effective channel length and operates
at 2.5 V. As the CMOS technology is extended into the
deep submicron range, it is estimated that the next
generation will have a nominal channel length of
0.15$\mu$m with a supply voltage of <or=2 V. In this
paper, two potential technologies with application to
1.X-V CMOS are presented. First, a bulk CMOS technology
with the nominal channel length of 0.15$\mu$m is
described. It is next argued that because of issues
related to power dissipation, such a device may face
problems when operated at its maximum speed-density
potential in high-performance logic chips. CMOS on a
silicon-on-insulator (SOI) substrate offers circuits
with lower power at the same performance. Such a CMOS
technology, with channel lengths down to less than
0.1$\mu$m, is described next. This technology is
particularly useful for applications near a 1.0-V
supply. We describe, for example, a 512 Kb SRAM with an
access time of less than 3.5 ns at 1.X V. The clear
power-performance advantage of CMOS on SOI over that of
CMOS on bulk silicon in the 1.X-V regime makes it the
technology of choice for sub-0.25-$\mu$m CMOS
generations.",
acknowledgement = ack-nhfb,
affiliation = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/sur Si/ss",
classcodes = "B2570D (CMOS integrated circuits); B1265 (Digital
electronics); B1265D (Memory circuits)",
classification = "525.4; 714.2; 721.3; 722.1; B1265 (Digital
electronics); B1265D (Memory circuits); B2570D (CMOS
integrated circuits)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.1 mum; 0.1 Mum; 0.15 mum; 0.15 Mum; 1 V; 1.X-volt
regime; 2 V; 512 Kb SRAM; 512 kbit; 512 Kbit; bulk CMOS
technology; Bulk CMOS technology; CMOS devices; CMOS
digital integrated circuits; CMOS integrated circuits;
CMOS scaling; CMOS technology; Deep submicron CMOS;
deep-submicron CMOS; Deep-submicron CMOS; dissipation;
effective channel; Effective channel length; Energy
dissipation; high-; High-performance logic chips; IC;
IC technology; integrated circuit; length; Logic chips;
Logic circuits; maximum speed-density potential;
Maximum speed-density potential; nominal channel
length; Nominal channel length; Nominal CMOS channel
length; Performance; performance logic chips; power;
Power dissipation; power-performance;
Power-performance; Random access storage; Semiconductor
devices; Silicon on insulator technology;
silicon-on-insulator; silicon-on-insulator substrate;
Silicon-on-insulator substrate; SOI; SRAM chips;
state-of-the-art CMOS; State-of-the-art CMOS;
substrates; Substrates; technology; ULSI; ULSI
circuits",
numericalindex = "Size 1.0E-07 m; Size 1.5E-07 m; Voltage 2.0E+00 V;
Voltage 1.0E+00 V; Storage capacity 5.24E+05 bit",
thesaurus = "CMOS digital integrated circuits; Integrated circuit
technology; Silicon-on-insulator; SRAM chips;
Substrates; ULSI",
treatment = "P Practical",
xxauthor = "G. G. Shahidi and J. D. Warnock and J. Comfort and S.
Fischer and P. A. McFarland and A. Acovic and T. I.
Chappell and B. A. Chappell and T. H. Ning and C. J.
Anderson and R. H. Dennard and J. Y.-C. Sun and M. R.
Polcari and B. Davari",
}
@Article{Taur:1995:CSC,
author = "Y. Taur and Y.-J. Mii and D. J. Frank and H.-S. Wong
and D. A. Buchanan and S. J. Wind and S. A. Rishton and
G. A. Sai-Halasz and E. J. Nowak",
title = "{CMOS} scaling into the 21st century: 0.1$\mu$m and
beyond",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "245--260",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-1.html#twenty",
abstract = "This paper describes the design, fabrication, and
characterization of 0.1-$\mu$m-channel CMOS devices
with dual n+/p+ polysilicon gates on 35-AA gate oxide.
A 2* performance gain over 2,5-V, 0.25-$\mu$m CMOS
technology is achieved at a power supply voltage of 1.5
V. In addition, a 20* reduction in active power per
circuit is obtained at a supply voltage <1 V with the
same delay as the 0.25-$\mu$m CMOS. These results
demonstrate the feasibility of high-performance and
low-power room-temperature 0.1-$\mu$m CMOS technology.
Beyond 0.1$\mu$m, a number of fundamental device and
technology issues must be examined: oxide and silicon
tunneling, random dopant distribution, threshold
voltage nonscaling, and interconnect delays. Several
alternative device structures (in particular,
low-temperature CMOS and double-gate MOSFET) for
exploring the outermost limit of silicon scaling are
discussed.",
acknowledgement = ack-nhfb,
affiliation = "Thomas J. Watson Research Cent",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
chemicalindex = "Si/int Si/el",
classcodes = "B2570D (CMOS integrated circuits); B2550F
(Metallisation and interconnection technology); B2550B
(Semiconductor doping)",
classification = "701.1; 712.1.1; 714.2; B2550B (Semiconductor
doping); B2550F (Metallisation and interconnection
technology); B2570D (CMOS integrated circuits)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.1 Mum; 0.1 mum; 0.25 Mum; 0.25 mum; 1 V; 1.5 V; 2.5
V; 35 A; Active power per circuit; CMOS; CMOS devices;
CMOS integrated circuits; CMOS scaling; CMOS
technology; delays; Design; design; dopant; Dopant
fluctuations; doping profiles; Double-gate MOSFET;
double-gate MOSFET; dual n+/p+ polysilicon; Dual n+/p+
polysilicon gates; Electric resistance; Electron
tunneling; elemental; Fabrication; fabrication;
fluctuations; gates; Gates (transistor); integrated
circuit interconnections; Integrated circuit layout;
Integrated circuit manufacture; integrated circuit
technology; Interconnect delays; interconnect delays;
low temperature; Low temperature CMOS; Low-temperature
CMOS; low-temperature CMOS; MOSFET devices; nonscaling;
Oxide tunnelling; oxide tunnelling; Polysilicon gates;
Random dopant distribution; random dopant distribution;
Semiconducting silicon; Semiconductor devices;
Semiconductor doping; semiconductors; Si; Si
tunnelling; Si, CMOS integrated circuits; SiGe devices;
silicon; Silicon tunneling; SOI devices; Temperature;
threshold voltage; Threshold voltage nonscaling;
tunnelling",
numericalindex = "Size 1.0E-07 m; Size 3.5E-09 m; Voltage 2.5E+00 V;
Size 2.5E-07 m; Voltage 1.5E+00 V; Voltage 1.0E+00 V",
thesaurus = "CMOS integrated circuits; Delays; Doping profiles;
Elemental semiconductors; Integrated circuit
interconnections; Integrated circuit technology;
Silicon; Tunnelling",
treatment = "P Practical",
}
@Article{Anonymous:1995:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "261--273",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:46:57 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:PRIa,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "39",
number = "1/2",
pages = "275--280",
month = jan # "\slash " # mar,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:46:54 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lagarias:1995:WAB,
author = "J. C. Lagarias and C. P. Tresser",
title = "A walk along the branches of the extended {Farey}
tree",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "283--294",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-3.html#one",
abstract = "The rational numbers can be presented as the set of
vertices of a degree-tree tree. If $p/q$ and $p'/q'$
are two rational numbers written in lowest terms, the
difference $pq'-p'q$ depends only on the shape of the
path joining $p/q$ to $p'/q'$ on this tree.",
acknowledgement = ack-nhfb,
affiliation = "AT and T Bell Labs., Murray Hill, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C1160 (Combinatorial mathematics); C4210 (Formal
logic)",
classification = "721.1; 921.1; 921.4; 921.6; C1160 (Combinatorial
mathematics); C4210 (Formal logic)",
corpsource = "AT and T Bell Labs., Murray Hill, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Binary sequences; Boolean algebra; degree-three tree;
Degree-three tree, Computation theory; extended Farey
tree; Extended Farey tree; Farey tree; number theory;
Number theory; rational numbers; Rational numbers;
Topology; trees (mathematics); Trees (mathematics)",
thesaurus = "Number theory; Trees [mathematics]",
treatment = "B Bibliography; T Theoretical or Mathematical",
}
@Article{Franaszek:1995:PDS,
author = "P. A. Franaszek and R. D. Nelson",
title = "Properties of delay-cost scheduling in time-sharing
systems",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "295--314",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/frana/frana.html",
abstract = "We consider properties of time-sharing schedulers with
operations based on an economic measure termed the
delay cost, and relate these to scheduling policies
such as those used in VM and MVS. One of these
policies, deadline scheduling, is shown to be
potentially unstable. We develop delay-cost schedulers
that meet similar performance objectives under
quasi-equilibrium conditions but which are stable under
rapidly varying loads.",
acknowledgement = ack-nhfb,
affiliation = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C6150N (Distributed systems software); C5440
(Multiprocessing systems)",
classification = "723.1; 723.2; 911.1; C5440 (Multiprocessing
systems), 722.4; C6150N (Distributed systems
software)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Algorithms; conditions; Costs; Data processing;
delay-cost scheduling; Delay-cost scheduling; Heuristic
programming; Microcomputers; performance objectives;
Performance objectives; policies; processor scheduling;
quasi-equilibrium; Quasi-equilibrium conditions,
Computer systems; scheduling; Scheduling; Scheduling
policies; time-sharing systems; Time-sharing systems;
virtual machines",
thesaurus = "Processor scheduling; Time-sharing systems; Virtual
machines",
treatment = "P Practical",
}
@Article{Park:1995:FOR,
author = "J. Park and S. Vassiliadis and J. G. Delgado-Frias",
title = "Flexible oblivious router architecture",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "315--329",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-3.html#three",
abstract = "In this paper we present a router architecture that
accommodates a family of oblivious routing algorithms.
The architecture is suitable for current technologies,
and it is intended for multiprocessor and massively
parallel systems. Via the proposed architecture, we
suggest that general-purpose routers can be designed to
accommodate a variety of multiprocessor interconnection
networks. In particular, the routing algorithms of
those interconnection structures that can be classified
as trees, cubes, meshes, and multistage interconnection
networks can be accommodated with a flexible, easily
implemented architecture. Our investigation strongly
suggests that a common design can satisfy at least
forty network topologies with the introduction of a few
instructions that are very simple to implement. The
overall conclusion is that general-purpose
cost-effective routers can potentially be designed that
perform equally as well as customized routing logic,
suggesting the possibility of a common router for
multiple interconnection networks. Furthermore, the
proposed architecture provides programming capabilities
that allow other oblivious routing algorithms not
considered in our investigation to be accommodated.",
acknowledgement = ack-nhfb,
affiliation = "Bellcore, Red Bank, NJ, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "C4230M (Multiprocessor interconnection); C5220P
(Parallel architecture); C1160 (Combinatorial
mathematics); C4210 (Formal logic); C5440
(Multiprocessing systems)",
classification = "721.1; 721.3; 722.3; 722.4; 723.1; 911.1; C1160
(Combinatorial mathematics); C4210 (Formal logic);
C4230M (Multiprocessor interconnection); C5220P
(Parallel architecture); C5440 (Multiprocessing
systems)",
corpsource = "Bellcore, Red Bank, NJ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "algorithms; Algorithms; Computer programming; Cost
effectiveness; cubes; Cubes; customized routing logic;
Customized routing logic, Computer architecture; Data
communication systems; Electric network topology;
flexible oblivious router architecture; Flexible
oblivious router architecture; Formal logic;
Interconnection networks; massively parallel systems;
Massively parallel systems; meshes; Meshes;
Multiprocessing systems; multiprocessor;
Multiprocessor; multiprocessor interconnection
networks; Multiprocessor interconnection networks;
oblivious routing; Oblivious routing algorithms;
Router; trees; Trees; trees (mathematics)",
thesaurus = "Multiprocessor interconnection networks; Trees
[mathematics]",
treatment = "P Practical",
}
@Article{Nobakht:1995:UTV,
author = "R. A. Nobakht",
title = "A unified table-based {Viterbi} subset decoder for
high-speed voice-band modems",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "331--334",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-3.html#four",
abstract = "A unified table-based subset decoder for the Viterbi
algorithm has been designed which is capable of
decoding any constellation size for any data rate
scheme of the CCITT (Comite Consultatif International
Telegraphique et Telephonique) V.32, V.32bis, and IBM
V.32ter high-speed, full-duplex voice-band modem
implementations with a constant number of computations.
In addition, no error is introduced as a result of this
subset decoding. The data rates include trellis coded
7200-, 9600-, 12000-, 14400-, 16800-, and 19200-bps
rates. The number of computations necessary to perform
the decoding is the same for any given data rate,
resulting in reductions in computational complexity up
to a factor of 32 in comparison to existing direct
methods. The memory consumption of the decoder is
relatively small and increases proportionally with data
rate.",
acknowledgement = ack-nhfb,
affiliation = "Rockwell Int. Corp., Newport Beach, CA, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B6220J (Modems); B6120B (Codes); C5630 (Networking
equipment)C4240C (Computational complexity)",
classification = "721.1; 722.1; 722.3; 723.1; 723.2; 921.4; B6120B
(Codes); B6220J (Modems); C4240C (Computational
complexity); C5630 (Networking equipment)",
corpsource = "Rockwell Int. Corp., Newport Beach, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Algorithms; band modems; CCITT; computational
complexity; Computational complexity; constellation
size; Constellation size; Data storage equipment;
high-speed voice-; High-speed voice-band modems; IBM
V.32ter; IBM V.32ter, Decoding; modems; Modems; Set
theory; Trellis codes; Unified table-based Viterbi
algorithm; unified table-based Viterbi subset decoder;
Unified table-based Viterbi subset decoder; V.32;
V.32bis; Viterbi algorithm; Viterbi decoding",
thesaurus = "Computational complexity; Modems; Viterbi decoding",
treatment = "P Practical",
}
@Article{Anonymous:1995:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "335--348",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:58:20 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "39",
number = "3",
pages = "349--368",
month = may,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:58:20 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-3.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kuan:1995:PCI,
author = "T. S. Kuan",
title = "Preface: On-Chip Interconnection Technology",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "370--370",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#one",
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ryan:1995:EIT,
author = "J. G. Ryan and R. M. Geffken and N. R. Poulin and J.
R. Paraszczak",
title = "The evolution of interconnection technology at {IBM}",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "371--381",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#two",
abstract = "Advances in interconnection technology have played a
key role in allowing continued improvements in
integrated circuit density, performance, and cost. IBM
contributions to interconnection technology over
approximately the last ten generations of semiconductor
products are reviewed. The development of a planar,
back-end-of-line (BEOL) technology, used in IBM DRAM,
bipolar, and CMOS logic products since 1988, has led to
a threefold increase in the number of wiring levels,
aggressive wiring pitches at all interconnection
levels, and high-leverage design options such as
stacked contacts and vias. Possible future BEOL
technologies are also discussed, with emphasis on the
use of higher-conductivity wiring and
lower-dielectric-constant insulators. It is expected
that their use will result in higher performance and
reliability. Applications include future, lower-power
devices as well as more cost-effective,
higher-performance versions of present-day designs.",
acknowledgement = ack-nhfb,
affiliation = "IBM Microelectronics Div",
affiliationaddress = "Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B1265B (Logic circuits); B2570D (CMOS integrated
circuits); B2570B (Bipolar integrated circuits); B0170N
(Reliability); B1265D (Memory circuits)",
classification = "701.1; 704; 704.2; 714.2; 721.2; 722.1",
corpsource = "Microelectron. Div., IBM Corp., East Fishkill, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "aggressive wiring pitches; Back-end-of-line
technology; BEOL technology; bipolar logic; bipolar
logic circuits; Chip design; CMOS; CMOS logic circuits;
CMOS logic products; conductivity wiring; cost; Cost
effectiveness; cost-effective designs; DRAM; DRAM
chips; Electric conductivity; Electric contacts;
Electric insulators; Electric wiring; high-; IBM;
integrated circuit; integrated circuit density;
Integrated circuit density; integrated circuit design;
Integrated circuit layout; integrated circuit
reliability; Integrated circuits; interconnection
technology; Interconnection technology;
interconnections; leverage design options; logic; Logic
devices; low-dielectric-constant insulators; low-power
devices; performance; Performance; performance designs;
Permittivity; planar back-end-of-line; Product design;
Random access storage; reliability; Reliability;
review; reviews; stacked contacts; technology; vias;
wiring levels; Wiring pitches",
treatment = "E Economic; G General Review; P Practical",
}
@Article{Edelstein:1995:VCI,
author = "D. C. Edelstein and G. A. Sai-Halasz and Y.-J. Mii",
title = "{VLSI} on-chip interconnection performance simulations
and measurements",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "383--401",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#three",
abstract = "We examine electrical performance issues associated
with advanced VLSI semiconductor on-chip
interconnections or ``interconnects.'' Performance can
be affected by wiring geometry, materials, and
processing details, as well as by processor-level
needs. Simulations and measurements are used to study
details of interconnect and insulator electrical
properties, pulse propagation, and CPU cycle-time
estimation, with particular attention to potential
advantages of advanced materials and processes for
wiring of high-performance CMOS microprocessors.
Detailed performance improvements are presented for
migration to copper wiring, low-[epsilon] dielectrics,
and scaled-up interconnects on the final levels for
long-line signal propagation.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570A (Integrated circuit modelling and process
simulation); B2550F (Metallisation and interconnection
technology); B2570D (CMOS integrated circuits)",
classification = "701.1; 704; 704.2; 714.2; 723.5; 942.2",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Advanced materials; advanced VLSI semiconductor
on-chip; Circuit density; CMOS integrated circuits;
Computer simulation; Copper; copper; CPU cycle-time
estimation; CPU cycletime estimation; Cu; Cu wiring;
details; Dielectric materials; Electric insulators;
Electric properties; Electric variables measurement;
Electric wiring; electrical performance;
Electromagnetic wave propagation; electromigration;
Geometry; high-performance CMOS microprocessors;
insulator electrical; integrated circuit; integrated
circuit interconnections; interconnections;
interconnects; long-line; low-epsilon dielectrics;
Microprocessor chips; migration; modelling; On-chip
interconnection; processing; processor-level needs;
properties; Pulse propagation; pulse propagation;
scaled-up interconnects; semiconductor process
modelling; Signal propagation; signal propagation;
VLSI; VLSI circuits; VLSI on chip interconnection
performance simulations; Wiring geometry; wiring
geometry",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Mann:1995:SLI,
author = "R. W. Mann and L. A. Clevenger and P. D. Agnello and
F. R. White",
title = "Silicides and local interconnections for
high-performance {VLSI} applications",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "403--417",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#four",
abstract = "As the minimum VLSI feature size continues to scale
down to the 0.1-0.2-$\mu$m regime, the need for
low-resistance local interconnections will become
increasingly critical. Although reduction in the MOSFET
channel length will remain the dominant factor in
achieving higher circuit performance, existing local
interconnection materials will impose greater than
acceptable performance limitations. We review the
state-of-the-art salicide and polycide processes, with
emphasis on work at IBM, and discuss the limitations
that pertain to future implementations in
high-performance VLSI circuit applications. A brief
review of various silicide-based and tungsten-based
approaches for forming local interconnections is
presented, along with a more detailed description of a
tungsten-based ``damascene'' local interconnection
approach.",
acknowledgement = ack-nhfb,
affiliation = "IBM Microelectronics Div",
affiliationaddress = "Essex Junction, VT, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2560R (Insulated gate field effect transistors);
B2570D (CMOS integrated circuits)",
classification = "543.5; 701.1; 704.2; 714.2; 804.2",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "0.1 to 0.2 mum; applications; approaches; circuit;
CMOS; CMOS integrated circuits; damascene local
interconnection approach; Electric resistance; Electric
wiring; Electronics industry; high performance VLSI;
IBM; IC; integrated circuit; interconnections; Local
interconnection; local interconnections;
low-resistance; minimum VLSI feature size; MOSFET;
MOSFET channel length; MOSFET devices; performance;
Performance; performance limitations; Polycide process;
polycide processes; review; reviews; salicide
processes; silicides; Silicides; Silicon compounds;
state-of-the-art; Tungsten; VLSI; VLSI circuits; W;
W-based",
treatment = "G General Review; P Practical",
}
@Article{Licata:1995:IFP,
author = "T. J. Licata and E. G. Colgan and J. M. E. Harper and
S. E. Luce",
title = "Interconnect fabrication processes and the development
of low-cost wiring for {CMOS} products",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "419--435",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#five",
abstract = "As the cost and performance of integrated circuit (IC)
interconnections, or ``interconnects,'' become
increasingly important to the development and
manufacturing of successful advanced IC products, so
also do underlying metallization and patterning
processes. In particular, the goals of achieving
product design specifications, low development cost
(high and early yield), low manufacturing cost, and
portability across products can only result from
applying robust unit processes that combine to form
integrable and scalable process modules. In this paper,
we review the interconnect fabrication processes used
to form currently manufactured IBM CMOS products, and
describe the materials and process integration issues
that motivated their selection. In addition, we
identify factors which may inhibit application of the
fabrication processes to future products having smaller
dimensions. The review suggests that large improvements
in cost and scalability can be achieved by forming
dual-damascene monolithic studs/wires. Previously, the
dual-damascene approach was not generally applicable
because of the lack of suitable metal deposition
techniques for filling high-aspect-ratio features with
highly conductive metal. However, recent advances may
provide that capability both for near-term applications
using Al-based wiring, and also for future applications
using more extendible Cu-based wiring.",
acknowledgement = ack-nhfb,
affiliation = "Materials Research Corp",
affiliationaddress = "Congers, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B2570D (CMOS integrated circuits)",
classification = "531; 704.2; 714.2; 902.2; 911.1; 913.1",
corpsource = "Materials Res. Corp., Congers, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "Al; Al-based wiring; aluminium; Aluminum; Aspect
ratio; circuit interconnections; CMOS; CMOS integrated
circuits; Conductive materials; copper; Copper; cost;
Costs; Cu; damascene monolithic studs/wires;
Deposition; design specifications; dual-; Electric
wiring; extendible Cu-based wiring; features; high
aspect-ratio; integrated; integrated circuit
interconnections; Integrated circuit interconnections;
Integrated circuit manufacture; integrated circuit
metallisation; integrated circuit yield; Interconnect
fabrication process; interconnect fabrication
processes; interconnects; low; low development cost;
low-cost wiring; manufacturing cost; metallization;
Metallization; Metallizing; patterning processes;
portability; process integration; product; Product
design; products; review; reviews; robust unit
processes; Scalability; scalable process modules;
Selection; Specifications; yield",
treatment = "E Economic; G General Review; P Practical",
}
@Article{Cote:1995:LTC,
author = "D. R. Cote and S. V. Nguyen and W. J. Cote and S. L.
Pennington and A. K. Stamper and D. V. Podlesnik",
title = "Low temperature chemical vapor deposition processes
and dielectrics for microelectronic circuit
manufacturing at {IBM}",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "437--464",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#six",
abstract = "Significant progress has been made over the past
decade in low-temperature plasma-enhanced and thermal
chemical vapor deposition (CVD). The progress has
occurred in response to the high demands placed on the
insulators of multilevel microelectronic circuits
because of the continuing reduction in circuit
dimensions. High-aspect-ratio gap filling is foremost
among these demands, which also include lower
processing temperatures and improved dielectric
planarization. This paper reviews the history of
interlevel and intermetal dielectrics used in
microelectronic circuit manufacturing at IBM and the
current status of processes used in IBM manufacturing
and development lines, and describes the challenges for
future memory and logic chip applications.",
acknowledgement = ack-nhfb,
affiliation = "IBM Microelectronics Div",
affiliationaddress = "Hopewell Junction, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B0520F (Vapour deposition); B0170E (Production
facilities and engineering); B2810 (Dielectric
materials and properties)B2570 (Semiconductor
integrated circuits); B1265B (Logic circuits); B1265D
(Memory circuits)",
classification = "704; 708.1; 714; 714.2; 802.2; 802.3",
corpsource = "Microelectron. Div., IBM Corp., East Fishkill, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "applications; Aspect ratio; Chemical vapor deposition;
chemical vapour deposition; circuit dimensions; CVD;
dielectric; Dielectric materials; dielectric thin
films; dielectrics; Electric insulators; high-aspect-;
history; IBM; integrated circuit manufacture;
Integrated circuit manufacture; integrated logic
circuits; integrated memory circuits; interlevel
dielectric; intermetal dielectrics; logic chip; Logic
circuits; low temperature chemical vapor deposition
processes; Low temperature operations; Low temperature
plasma enhanced chemical vapor deposition; low-; lower
processing temperatures; memory chip applications;
microelectronic circuit manufacturing; Microelectronic
circuit manufacturing; microelectronic circuits;
Microelectronic processing; Microelectronics;
multilevel; planarization; plasma CVD; ratio gap
filling; review; reviews; temperature plasma enhanced
chemical vapor deposition; thermal chemical vapor
deposition; Thermal chemical vapor deposition",
treatment = "G General Review; P Practical",
}
@Article{Hu:1995:ESV,
author = "C.-K. Hu and K. P. Rodbell and T. D. Sullivan and K.
Y. Lee and D. P. Bouldin",
title = "Electromigration and stress-induced voiding in fine
{Al} and {Al}-alloy thin-film lines",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "465--497",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-4.html#seven",
abstract = "Physical phenomena underlying failure due to
electromigration and stress-induced voiding in fine Al
and Al-alloy thin-film conducting lines are examined in
the context of accelerated testing methods and
structures. Aspects examined include effects due to
line isolation (the absence of reservoirs at conductor
ends), solute and precipitate phenomena, conductor
critical (Blech) length, microstructure, film
deposition conditions, and thermal processing
subsequent to film deposition. Emphasis is on the
isolated, submicron-wide, Al(Cu)-based thin-film
interconnection lines of IBM VLSI logic and memory
chips.",
acknowledgement = ack-nhfb,
affiliation = "IBM Research Div",
affiliationaddress = "Yorktown Heights, NY, USA",
ajournal = "IBM J. Res. Develop.",
classcodes = "B2550F (Metallisation and interconnection technology);
B0170N (Reliability); B0170E (Production facilities and
engineering); B1265D (Memory circuits); B1265B (Logic
circuits); B2570 (Semiconductor integrated circuits)",
classification = "541.1; 541.2; 701.1; 704; 708.2; 714.2",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Dev",
keywords = "accelerated testing methods; Al; Al alloy thin film
lines; AlCu; aluminium; aluminium alloys; Aluminum;
Aluminum alloys; circuits; conducting; Conductive
films; conductor critical Blech length; conductor ends;
copper alloys; crystal; Deposition; deposition
conditions; Electric conductors; Electric lines;
electromigration; Electromigration; failure; failure
analysis; film; film deposition; film lines; fine Al
alloy thin; Heat treatment; IBM VLSI logic chips; IBM
VLSI memory chips; integrated circuit; integrated
circuit interconnections; integrated logic circuits;
integrated memory; isolated submicron-wide AlCu-based
thin-film interconnection; life testing; line
isolation; lines; Logic circuits; Memory chips;
Microprocessor chips; microstructure; Microstructure;
On-chip interconnections; Precipitate; precipitate
phenomena; precipitation; reservoirs; solute; Solute;
stress-induced voiding; Stress-induced voiding;
testing; thermal processing; Thermal processing; Thin
films; Thin-film lines; VLSI; VLSI circuits; voids
(solid)",
treatment = "P Practical; X Experimental",
}
@Article{Anonymous:1995:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "499--??",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:13:58 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1995:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "39",
number = "4",
pages = "513--??",
month = jul,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 05 07:13:54 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd38-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ohta:1995:UMR,
author = "T. Ohta",
title = "Use of multiple representations for simulating cloth
shapes and motions: An overview",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "523--530",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html#one",
abstract = "Cloth is relatively difficult to simulate for computer
graphics, primarily because of the complexity of its
shapes and motions. Because of the presence of numerous
folds and wrinkles of various sizes, conventional means
cannot be used to measure or recreate its shapes. This
overview describes a method in which a physically based
simulation technique is adapted for generating cloth
shapes and motions, and presents some examples of
images produced by the method. Use is made of a
structure composed of multiple representations or
``layers,'' each of which is assigned a different role
in calculation: typically, surface rendering, dynamics,
collision detection, and stitching. Inclusion of the
latter makes it possible to simulate the joining
together of several cloth sections, thus making the
method applicable to geometrically complicated tasks
such as clothing design. Deformations of cloth objects
can be calculated by solving associated equations of
motion in a time-marching manner, thereby also
producing serial data for animation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6130B (Graphics techniques)",
corpsource = "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cloth shapes; collision detection; computer graphics;
dynamics; folds; motions; multiple representations;
rendering (computer graphics); stitching; surface
rendering; wrinkles",
treatment = "P Practical",
}
@Article{Niijima:1995:DSF,
author = "H. Niijima",
title = "Design of a solid-state file using flash {EEPROM}",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "531--545",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html#two",
abstract = "This paper presents dynamic sector allocation,
clustered sector allocation, and background garbage
collection --- mechanisms that are key algorithms in
solid-state files (SSFs) using flash EEPROMs. Dynamic
sector allocation resembles a log-structured file
system, which sequentially writes all data
modifications to the SSF. Clustered sector allocation
is a technique for using the dynamic sector allocation
mechanism in an SSF that incorporates a NAND flash
EEPROM architecture. Dynamic sector allocation
inevitably accumulates obsolete data on the SSF. This
``garbage'' must be erased in order to secure free
space on the SSF. The garbage collection mechanism is a
free-space-management method performed as a background
process in the SSF. These three mechanisms are closely
related and work collaboratively to enable flash
EEPROMs to perform well in spite of the serious
inherent limitations of the devices. We simulated the
behavior of several SSFs and observed that 30\% of the
storage area of the SSFs must be used as a work area in
order to ensure an acceptably low rate of memory-erase
operations. We also demonstrated that the lifetime of
the SSF is long enough for use in most personal
computers. Finally, we have developed SSFs using the
NAND type of flash EEPROMs that incorporate the above
mechanisms.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320G (Semiconductor storage); C6120 (File
organisation)",
corpsource = "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "background garbage collection; clustered sector
allocation; dynamic sector allocation; EPROM; flash
EEPROM; sector allocation; solid-state file;
solid-state files; storage management",
treatment = "P Practical",
}
@Article{Deutsch:1995:MCL,
author = "A. Deutsch and G. V. Kopcsay and C. W. Surovic and B.
J. Rubin and L. M. Terman and R. P. {Dunne, Jr.} and T.
A. Gallo and R. H. Dennard",
title = "Modeling and characterization of long on-chip
interconnections for high-performance microprocessors",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "547--567",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html#three",
abstract = "Long on-chip interconnections with dimensions larger
than the minimum ground rules are rigorously analyzed
and experimentally characterized for the first time. A
test vehicle has been built and characterized with
representative wiring found in high-performance CMOS
microprocessor chips (line lengths of 0.8-1.6 cm, and
line widths of 0.9-4.8$\mu$m using a five-metal-layer
structure). The need for distributed RLC
transmission-line representation is highlighted through
measured and simulated results. By showing the problems
encountered when using long, nonuniform on-chip
transmission lines, guidelines are developed to take
advantage of the lower-resistance interconnections for
use in high-speed, cycle-determining paths. Such
guidelines are given both for current and optimized
wiring practices and for cross-sectional structures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2550F
(Metallisation and interconnection technology); C5130
(Microprocessor chips); C5470 (Performance evaluation
and testing)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "high-; integrated circuit interconnections; long
on-chip interconnections; microprocessor chips;
microprocessors; on-chip transmission lines;
performance CMOS microprocessor chips; performance
evaluation; results; simulated; wiring",
treatment = "P Practical",
}
@Article{Nobakht:1995:AAC,
author = "R. A. Nobakht",
title = "An algorithm for adaptive cancellation of phase
jitter",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "569--573",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html#four",
abstract = "Proposed here is a new algorithm for adaptive
cancellation of phase jitter. If all of the possible
sources of phase jitter are known a priori for a given
system, it should be possible to adaptively filter out
their effects through use of the algorithm. In addition
to offering a cost-effective solution for combating the
effects of severe phase jitter, the algorithm should
respond rapidly to varying sources of phase jitter and
should not encounter any noise/bandwidth conflicts.
Hence, it should be applicable with no sacrifice in
performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6210 (Telecommunication applications); C5600 (Data
communication equipment and techniques)",
corpsource = "Rockwell Int. Corp., Newport Beach, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adaptive cancellation; conflicts; data communication;
jitter; noise/bandwidth; phase jitter",
treatment = "P Practical",
}
@Article{Agarwal:1995:TAP,
author = "R. C. Agarwal and S. M. Balle and F. G. Gustavson and
M. Joshi and P. Palkar",
title = "A three-dimensional approach to parallel matrix
multiplication",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "575--582",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html#five",
abstract = "A three-dimensional (3D) matrix multiplication
algorithm for massively parallel processing systems is
presented. The $P$ processors are configured as a
``virtual'' processing cube with dimensions $p[1]$,
$p[2]$, and $p[3]$ proportional to the matrices'
dimensions --- $M$, $N$, and $K$. Each processor
performs a single local matrix multiplication of size
$M/p[1]\times{}N/p[2]\times{}K/p[3]$. Before the local
computation can be carried out, each subcube must
receive a single submatrix of $A$ and $B$. After the
single matrix multiplication has completed, $K/p[3]$
submatrices of this product must be sent to their
respective destination processors and then summed
together with the resulting matrix $C$. The 3D parallel
matrix multiplication approach has a factor of
$P^{1/6}$ less communication than the 2D parallel
algorithms. This algorithm has been implemented on IBM
POWERparallel* SP2* systems (up to 216 nodes) and has
yielded close to the peak performance of the machine.
The algorithm has been combined with Winograd's variant
of Strassen's algorithm to achieve performance which
exceeds the theoretical peak of the system. (We assume
the MFLOPS rate of matrix multiplication to be 2MNK.)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C4140 (Linear algebra); C4240P (Parallel programming
and algorithm theory); C6110P (Parallel programming)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D parallel matrix multiplication; IBM; local matrix
multiplication; massively parallel; matrix
multiplication; parallel algorithms; parallel matrix
multiplication; POWERparallel SP2 systems; processing;
three-dimensional",
treatment = "P Practical; T Theoretical or Mathematical",
}
@Article{Anonymous:1995:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "583--594",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:52:26 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:PRIb,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "39",
number = "5",
pages = "595--600",
month = sep,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:52:26 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-5.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wickramasinghe:1995:P,
author = "H. K. Wickramasinghe and D. Rugar",
title = "Preface",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "602--602",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:53:38 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#one",
abstract = "Ten years has passed since the 1986 publication of two
issues of the IBM Journal of Research and Development
reviewing the scanning tunneling microscopy (STM)
technique. In the same year, two IBM Zurich Research
Laboratory scientists, G. Binnig and H. Rohrer, shared
the Nobel Prize in physics for their pioneering work in
this field. Since then, the STM field has grown at a
tremendous rate and has stimulated a range of new
techniques. The STM showed that it was possible to scan
a conducting sample surface with a sharp probe tip
located about a nanometer above the surface and, by
adjusting the tip-surface distance to maintain a
constant current, produce three-dimensional images
having atomic-scale resolution. To achieve this
resolution, the STM has relied on piezoelectric drives
and feedback electronics for scanning and for
controlling the vertical motion of the probe tip.
Besides atomic imaging, a scanning tunneling
spectroscopic (STS) version of the STM has been used to
characterize the electron density of states of surfaces
from measurements of the voltage dependence of the
tunneling current at tip-to-surface distances of about
one angstrom. STM has enabled the measurement of a
variety of phenomena such as luminescence, nonlinear
optical mixing, and the probing of Schottky barriers
with ballistic electron emission. In addition, the STM
has been used for surface modification, a supreme
example of which is the writing of patterns and
structures on crystal surfaces by moving single xenon
atoms. The STM has also been used to perform localized
electrochemistry and to selectively modify surfaces by
using the high electric fields available at the probe
tip to deposit or remove material. In parallel with
these accomplishments and novel studies of conductive
surfaces achieved during the early STM years, Binnig,
Quate (Stanford), and Gerber (IBM) developed the atomic
force microscope (AFM) in 1986. This instrument
operated on a principle different from the STM --- it
measured the repulsive force interaction between the
electron clouds on the probe tip atoms and those on the
sample surface atoms --- and opened a path to imaging
both insulating and conducting surfaces with atomic
resolution. The frictional force microscope, a
variation of the AFM, measures the lateral force of
atomic interactions as the probe traverses the surface.
As AFM technology matured, the force sensitivity
increased by several orders of magnitude. The higher
sensitivity of attractive-mode or noncontact AFM gave
rise to new forms of nanometer-scale microscopies,
including magnetic force microscopy (MFM) for imaging
magnetic properties and kelvin probe (KPFM) and
electrostatic force microscopy (EFM) for imaging charge
and surface potentials. Magnetic resonance force
microscopy (MRFM) extended the MFM concept to measure
nuclear spins --- with the eventual possibility, given
sufficient improvement in force sensitivity, of
detecting the nuclear spin of a single atom. Other
forms of scanning probe microscopes --- those that do
not depend on tunneling or forces between a probe tip
and a sample surface --- have also been demonstrated.
Examples include the scanning thermal microscope, which
responds to local thermal properties of surfaces, the
scanning capacitance microscope for dopant profiling,
and the near-field optical microscope. More recently,
the scanning SQUID microscope with a spatial resolution
of 10 micrometers has been used to observe half-integer
flux quanta, and the femtosecond field-emission camera
has been used to detect the motion of individual atoms
and molecules. Scanning probe microscopy has found
practical application as well. Noncontact AFM for
metrology has moved into manufacturing lines. MFM and
the scanning capacitance microscope have become tools
of development laboratories. Although commercial
products have yet to be realized, they are on the
horizon. Data storage is an important area of product
exploration: The storage and retrieval of information
on a 10-nm scale has been demonstrated using scanning
probe techniques. Although the achievable data rates do
not satisfy present requirements, they are improving;
recent demonstrations with near-field optics have
brought them much closer to acceptable values. \par
In summary, the underlying principle of the STM has
provided impetus for the development by many
investigators of various related techniques. These
techniques utilize the piezoelectric scanning and
feedback principles of the STM, but they form images by
monitoring a variety of local interactions other than
the tunnel current. We have briefly described the
evolution of the STM into what can now be generically
termed scanning (or proximal) probe microscopy, which
has occurred since the first STM-related issues of this
Journal. The papers in the present issue describe
recent progress by IBM researchers in a number of these
new techniques. \par
H. Kumar Wickramasinghe and Daniel Rugar, Guest
Editors",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Avouris:1995:PET,
author = "Ph. Avouris and I.-W. Lyo and Y. Hasegawa",
title = "Probing electrical transport, electron interference,
and quantum size effects at surfaces with {STM\slash
STS}",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "603--616",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#two",
abstract = "We use scanning tunneling microscopy (STM) and
spectroscopy (STS) to probe electrical transport
through the dangling-bond surface states of
semiconductors and electron scattering and electron
confinement effects in metal surface states.
Specifically, we use point contacts between the STM tip
and the sample to show the existence of surface
electrical transport in Si(111)-$7 \times 7$. Point
contacts to silicon islands provide further support for
the existence of the surface transport channel and
illustrate the role played by carrier scattering at the
boundaries of the nanostructure in electrical
transport. In contrast to the silicon case, electrons
in Shockley-type metal surface states act like a
quasi-two-dimensional free-electron gas (2DFEG). This
2DFEG is scattered by steps, adsorbates, and defects,
and the interference between incident and reflected
electron waves leads to an oscillatory local density of
states (LDOS). This LDOS is imaged in STM spectroscopic
maps, and analysis of the oscillations provides novel
information regarding electron scattering by individual
surface features. Steps are found to act as barriers
for surface electrons, and this property is utilized to
confine them and form structures of lower
dimensionality. Quasi-1D structures (quantum wires) are
generated at narrow terraces of stepped surfaces, while
small metal islands behave as 0D structures (quantum
dots). Confined states with discrete spectra are
observed even at 300 K, and their probability
distributions are imaged.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A7325 (Surface conductivity and carrier phenomena);
A7320D (Electron states in low-dimensional structures);
A7340L (Semiconductor-to-semiconductor contacts, p-n
junctions, and heterojunctions); A7335 (Mesoscopic
systems); A7320H (Surface impurity and defect levels;
energy levels of adsorbed species); A7320A (Surface
states, band structure, electron density of states);
A7215Q (Scattering mechanisms and Kondo effect
(metals/alloys))",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "2DFEG; carrier scattering; dangling bonds;
dangling-bond surface states; defect states; effect;
electrical transport; electron confinement effects;
electron interference; electronic density of states;
elemental semiconductors; free-electron gas; impurity
scattering; lectron scattering; metal; metals;
microscopy; nanostructure; nanostructured materials;
oscillatory local density of states; point contact
spectroscopy; point contacts; quantum dots; quantum
interference phenomena; quantum size;
quasi-two-dimensional; scanning tunneling; scanning
tunneling microscopy; scanning tunnelling; scanning
tunnelling spectroscopy; semiconductor; semiconductor
quantum wires; semiconductors; Shockley-type metal
surface states; Si; Si(111)-7*7; silicon; size;
spectroscopy; states; steps; STM/STS; surface; surface
conductivity; surface electrical; surface scattering;
surface states; surfaces; transport; two-dimensional
electron gas",
treatment = "X Experimental",
}
@Article{Mate:1995:FMS,
author = "C. M. Mate",
title = "Force microscopy studies of the molecular origins of
friction and lubrication",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "617--627",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#three",
abstract = "The atomic force microscope (AFM) has become a
valuable instrument in recent years for studying the
atomic and molecular origins of friction and
lubrication. This paper reviews the effort in our
laboratory using force microscopy to develop a
molecular-scale understanding of friction and
lubrication. Among the topics covered in this paper are
(1) the nanomechanics and adhesive forces of lubricated
and unlubricated surfaces, (2) the observation of
atomic-scale features and their effect on the friction
force for AFM tips sliding over graphite and mica
surfaces, and (3) the effect of lubricating surfaces
with bonded and unbonded perfluoropolyether polymers
and with water molecules adsorbed from the ambient.
Many of the descriptions developed using macroscopic
continuum mechanics analysis are still applicable to
these atomic-scale contact zones. However, a complete
interpretation of the results requires incorporating
descriptions of the atomic and molecular processes into
the continuum mechanics analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6220P (Tribology); A0130R (Reviews and tutorial
papers; resource letters); A8140P (Friction,
lubrication, and wear); A6820 (Solid surface
structure); A6845B (Sorption equilibrium at solid-fluid
interfaces); A4630P (Friction, wear, adherence,
hardness, mechanical contacts)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adhesion; adhesive forces; adsorbed layers; AFM tips;
analysis; atomic force microscopy; atomic processes;
atomic-scale contact zones; bonded; C; continuum
mechanics; force microscopy; friction; graphite;
lubricated surfaces; lubrication; macroscopic continuum
mechanics; mechanical contact; mica surfaces; molecular
processes; molecular-scale; nanomechanics;
perfluoropolyether polymers; polymers; review; reviews;
sliding; sliding friction; unbonded perfluoropolyether;
unlubricated surfaces; water molecules",
treatment = "G General Review; T Theoretical or Mathematical; X
Experimental",
}
@Article{Lutz:1995:AFM,
author = "M. A. Lutz and R. M. Feenstra and J. O. Chu",
title = "Atomic force microscopy studies of {SiGe} films and
{Si\slash SiGe} heterostructures",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "629--637",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#four",
abstract = "Atomic force microscopy (AFM) is used to study the
topography of strained SiGe films and multilayer
Si/SiGe heterostructures. Strain relaxation processes
are found to determine the formation of surface
morphology, with distinct morphological features
arising from both misfit dislocation formation and
three-dimensional growth of coherent islands and pits
on the surface. Studies of these features for various
values of strain (Ge content) and growth temperature
reveal the underlying physical processes determining
the strain relaxation. Fourier analysis of AFM images
is performed to obtain quantitative roughness
information and to separate roughness components of
different physical origin.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6865 (Layer structures, intercalation compounds and
superlattices: growth, structure and nonelectronic
properties); A6820 (Solid surface structure); A6848
(Solid-solid interfaces); A6170L (Slip, creep, internal
friction and other indirect evidence of dislocations);
A6855 (Thin film growth, structure, and epitaxy); A6860
(Physical properties of thin films, nonelectronic)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "AFM; AFM images; atomic force microscopy; coherent
islands; components; dimensional growth; dislocations;
films; Fourier analysis; Ge content; Ge-Si alloys;
growth temperature; heterostructures; interface
structure; internal stresses; materials; misfit
dislocation formation; multilayer Si/SiGe
heterostructures; pits; roughness; semiconductor;
semiconductor superlattices; semiconductor thin;
Si-GeSi; Si/SiGe; SiGe films; strain relaxation;
strained SiGe films; stress relaxation; surface;
surface morphology; surface structure; three-;
topography",
treatment = "X Experimental",
}
@Article{Chambliss:1995:USS,
author = "D. D. Chambliss and R. J. Wilson and S. Chiang",
title = "The use of {STM} to study metal film epitaxy",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "639--654",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#five",
abstract = "In this paper we review work we have done at the IBM
Almaden Research Center using the scanning tunneling
microscope to understand the epitaxial growth of metal
films. In particular, we explore the important role of
deposit-substrate interactions in controlling growth
and film structure, both by strain of the substrate and
by place-exchange intermixing. These are illustrated
first by the growth traits of Au, Ag, Ni, and Fe on
Au(111) and their relationship to the herringbone
reconstruction. Au on Ag(110) is presented as a clear
example of spontaneous penetration of the substrate by
deposited material at room temperature. Fe on Cu(100)
is a more subtle example of the effect of
place-exchange and of ways to observe it. The
martensitic transformation of thicker Fe films on
Cu(100) demonstrates the importance of bulklike
structural changes in metastable epitaxial films.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A6855 (Thin film growth, structure, and epitaxy);
A6820 (Solid surface structure); A0130R (Reviews and
tutorial papers; resource letters); A6842 (Surface
phase transitions and critical phenomena); A6470K
(Solid-solid transitions); A8130K (Martensitic
transformations)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "20 C; Ag; Ag(110); Au; Au(111); bulklike; Cu; Cu(100);
deposit-substrate; epitaxial growth; epitaxial layers;
Fe; film structure; herringbone; interactions;
intermixing; internal stresses; martensitic
transformation; martensitic transformations; metal film
epitaxy; metallic; metastable epitaxial films;
microscope; Ni; place-exchange; reconstruction; review;
reviews; room; scanning tunneling; scanning tunnelling
microscopy; spontaneous penetration; STM; strain;
structural changes; surface phase transformations;
surface reconstruction; temperature; vapour phase
epitaxial growth",
treatment = "G General Review; X Experimental",
}
@Article{Kirtley:1995:DAS,
author = "J. R. Kirtley and M. B. Ketchen and C. C. Tsuei and J.
Z. Sun and W. J. Gallagher and Lock See Yu-Jahnes and
A. Gupta and K. G. Stawiasz and S. J. Wind",
title = "Design and applications of a scanning {SQUID}
microscope",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "655--668",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#six",
abstract = "The scanning SQUID (Superconducting Quantum
Interference Device) microscope is an extremely
sensitive instrument for imaging local magnetic fields.
We describe one such instrument which combines a novel
pivoting lever mechanism for coarse-scale imaging with
a piezoelectric tube scanner for fine-scale scans. The
magnetic field sensor is an integrated miniature SQUID
magnetometer. This instrument has a demonstrated
magnetic field sensitivity of < 10$^{-6}$ gauss/[square
root ]Hz at a spatial resolution of [approximately] 10
$\mu$m. The design and operation of this scanning SQUID
microscope are described, and several illustrations of
the capabilities of this technique are presented. The
absolute calibration of this instrument with an ideal
point source, a single vortex trapped in a
superconducting film, is shown. The use of this
instrument for the first observation of half-integer
flux quanta, in tricrystal thin-film rings of
YBa[2]Cu[3]O[7]- [delta], is described. The
half-integer flux quantum effect is a general test of
the symmetry of the superconducting order parameter.
One such test rules out symmetry-independent mechanisms
for the half-integer flux quantum effect, and proves
that the order parameter in YBa[2]Cu[3]O[7]-[delta] has
lobes and nodes consistent with $d$-wave symmetry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0755 (Magnetic instruments and techniques); A0620H
(Measurement standards and calibration); A7475
(Superconducting films); A7470V (Perovskite phase
superconductors); A7460G (Flux pinning, flux motion,
fluxon-defect interactions); B7230 (Sensing devices and
transducers)B3240C (Superconducting junction devices);
B7310L (Magnetic variables measurement); B7130
(Measurement standards and calibration); B3220
(Superconducting materials)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "10 mum; barium compounds; calibration; coarse-scale
imaging; d-wave symmetry; fine-scale scans; flux
pinning; half-; half-integer flux quanta; high-;
integer flux quantum effect; integrated; Interference
Device; local magnetic fields; magnetic field
sensitivity; magnetic field sensor; magnetic sensors;
magnetometers; mechanism; miniature SQUID magnetometer;
parameter; piezoelectric tube scanner; pivoting lever;
scanning SQUID microscope; single vortex; spatial
resolution; SQUID; superconducting film;
superconducting order; Superconducting Quantum;
superconducting thin films; symmetry-independent
mechanisms; temperature superconductors; thin-film
rings; tricrystal; YBa$_2$Cu/sub 3/O/sub 7- delta /;
YBa$_2$Cu/sub 3/O/sub 7/; yttrium compounds",
treatment = "P Practical; X Experimental",
}
@Article{McClelland:1995:FFC,
author = "G. M. McClelland and H. Heinzelmann and F. Watanabe",
title = "The femtosecond field-emission camera, a device for
continuous observation of the motion of individual
adsorbed atoms and molecules",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "669--680",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#seven",
abstract = "A new instrument, the femtosecond field-emission
camera (FFEC), has been developed to continuously
record the motion of single adsorbed atoms or
molecules, with an ultimate achievable time resolution
of 10$^{-14}$ s. In the FFEC, the motion of an adsorbed
species modulates a strong 10$^{-5}$-A field-emission
current from a sharp tip. The emitted electrons are
focused into a beam, which is swept electrostatically
across a detector screen. The tip substrate can be
imaged atomically by field ion microscopy. In this
paper, the construction and operating principles of the
FFEC are described in some detail, and previously
published experiments are reviewed. On a <111> W tip,
single Cs atoms are observed to jump between sites
instantaneously within the 2-ps instrumental
resolution. Individual copper phthalocyanine molecules
are observed vibrating with respect to the substrate
with a period of [approximately] 10 ps. The time
resolution of the FFEC is limited principally by the
time-of-flight spread of the electrons between the tip
and the deflecting field.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A6845B (Sorption equilibrium at solid-fluid
interfaces); A6820 (Solid surface structure); A6822
(Surface diffusion, segregation and interfacial
compound formation); A6830 (Dynamics of solid surfaces
and interface vibrations); B2390 (Electron and ion
microscopes)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "10 ps; 10E-14 s; 10E-5 A; absorbed atoms; adsorbed
layers; adsorbed molecules; adsorbed species; caesium;
cameras; continuous observation; copper compounds;
copper phthalocyanine; Cs; detector screen; diffusion;
electrons; emission current; emission electron
microscopes; femtosecond field-emission camera; field;
field ion; field-; individual adsorbed atoms;
microscopy; molecules; organic compounds; single;
single Cs atoms; surface; surface phonons; surface
structure; time resolution; time-of-flight spread; W; W
tip",
treatment = "P Practical; X Experimental",
}
@Article{Mamin:1995:HDS,
author = "H. J. Mamin and B. D. Terris and L. S. Fan and S. Hoen
and R. C. Barrett and D. Rugar",
title = "High-density data storage using proximal probe
techniques",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "681--699",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#eight",
abstract = "We describe some of the achievements and problems
associated with proximal probe-based approaches to
high-density data storage. While STM-based methods have
demonstrated spectacular areal densities dwarfing
anything achievable with today's storage technologies,
reliability and data rate issues present serious
obstacles. These problems have led us to focus on
techniques based on AFM and near-field optics. First,
we have developed a thermomechanical writing scheme
using an AFM tip. We have addressed many of the
practical issues involved, including data rate. With
custom low-mass cantilevers, we have demonstrated
readback on real data with a data rate of 1.2 Mb/s. We
have also pursued nontopographic storage techniques
based on charge storage in nitride-oxide semiconductor
structures and near-field optical storage. These
techniques should be able to achieve densities
comparable to those reached with the AFM scheme, with
the added advantage that they are fast and reversible.
Although it is not yet clear whether any of these
probe-based approaches can ever be made practical, they
do represent potential pathways to the higher densities
that will be needed in the decades ahead.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2575 (Micromechanical device technology); B4120
(Optical storage and retrieval); B2530F
(Metal-insulator-semiconductor structures)",
corpsource = "IBM Res. Div., Almaden Res. Center, San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1.2; AFM; AFM tip; areal densities; atomic force
microscopy; based methods; boundaries; charge storage;
custom low-mass cantilevers; data rate; digital
storage; high-density data storage; Mbit/s; microscopy;
nanotechnology; near-field optical storage; near-field
optics; nitride-oxide-; nontopographic; optical
storage; proximal probe techniques; readback;
reliability; scanning tunnelling; semiconductor
storage; semiconductor structures;
semiconductor-insulator; Si-SiO$_2$-Si/sub 3/N/sub 4/;
STM-; storage techniques; thermomechanical writing
scheme",
treatment = "G General Review; P Practical",
}
@Article{Pohl:1995:STA,
author = "D. W. Pohl",
title = "Some thoughts about scanning probe microscopy,
micromechanics, and storage",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "701--711",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html#nine",
abstract = "Interaction and actuation mechanisms used in scanning
probe microscopies (SPM) have inherent potential for
storage applications, but many unresolved conceptual
and technical questions have precluded a thorough
assessment of this potential so far. However, the
intrinsic properties of SPM instrumentation and
tip/sample interactions allow a number of important
parameters and their ultimate values to be estimated.
Coping with and possibly surpassing established
technologies will require massive parallelism of
SPM-type recording heads, a condition that might be
satisfied in an elegant manner by using SPM-type,
circulating piezoelectric flexural actuators. Operation
of an entire array of recording heads will require
highly precise micromechanical manufacturing and/or
sophisticated control mechanisms. The resulting
tolerance requirement can be relaxed by choosing
long-range SPM interactions (Coulomb forces,
capacitance, near-field optics, etc.). Furthermore, the
interaction must allow a high recording speed. The
restriction to read-only storage can facilitate
exploratory work; the writing process in this case
might be replaced by replication, similar to the
techniques used in the production of compact disks.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A0780 (Electron and ion microscopes and techniques);
A0710 (Mechanical measurement methods and instruments);
A4230N (Optical storage and retrieval); B2575
(Micromechanical device technology); B2860
(Piezoelectric and ferroelectric devices); B4120
(Optical storage and retrieval)",
corpsource = "Zurich Res. Lab., IBM Res. Div., Ruschlikon,
Switzerland",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "actuation mechanisms; capacitance; circulating;
Coulomb forces; digital storage; high recording speed;
interactions; long-range SPM; manufacturing;
microactuators; micromachining; micromechanical;
micromechanical devices; micromechanics; microscopy;
near-field; optical storage; optics; piezoelectric
actuators; piezoelectric flexural actuators; read-only
storage; recording heads; replication; scanning probe;
scanning probe microscopies; scanning probe microscopy;
SPM; storage; tip/sample interactions; tolerance
requirement; writing process",
treatment = "G General Review; P Practical",
}
@Article{Anonymous:1995:RPIe,
author = "Anonymous",
title = "Recent publications by {IBM} authors in other
journals",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "713--728",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:53:36 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:PRIc,
author = "Anonymous",
title = "Patents recently issued to {IBM} inventors",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "729--728",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:53:34 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:AIV,
author = "Anonymous",
title = "Author index for Volume 39",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "739--743",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:53:23 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1995:SIV,
author = "Anonymous",
title = "Subject index for Volume 39",
journal = j-IBM-JRD,
volume = "39",
number = "6",
pages = "745--751",
month = nov,
year = "1995",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 12:53:37 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd39-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ziegler:1996:PTC,
author = "J. F. Ziegler and G. R. Srinivasan",
title = "Preface: Terrestrial Cosmic Rays and Soft Errors",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "2--2",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#one",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ziegler:1996:IES,
author = "J. F. Ziegler and H. W. Curtis and H. P. Muhlfeld and
C. J. Montrose and B. Chin and M. Nicewicz and C. A.
Russell and W. Y. Wang and L. B. Freeman and P. Hosier
and L. E. LaFave and J. L. Walsh and J. M. Orro and G.
J. Unger and J. M. Ross and T. J. O'Gorman and B.
Messina and T. D. Sullivan and A. J. Sykes and H.
Yourke and T. A. Enger and V. Tolat and T. S. Scott and
A. H. Taber and R. J. Sussman and W. A. Klein and C. W.
Wahaus",
title = "{IBM} experiments in soft fails in computer
electronics (1978--1994)",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "3--18",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#two",
abstract = "This historical review covers IBM experiments in
evaluating radiation-induced soft fails in LSI
electronics over a fifteen-year period, concentrating
on major scientific and technical advances which have
not been previously published.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0180 (Other general electrical engineering topics);
B0170N (Reliability); B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer electronics; failure; failure analysis;
historical review; history; IBM; integrated circuit
reliability; large scale integration; LSI electronics;
radiation effects; radiation-induced; reviews; soft
fails",
treatment = "G General Review; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ziegler:1996:TCR,
author = "J. F. Ziegler",
title = "Terrestrial cosmic rays",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "19--39",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#three",
abstract = "This paper reviews the basic physics of those cosmic
rays which can affect terrestrial electronics. Cosmic
rays at sea level consist mostly of neutrons, protons,
pions, muons, electrons, and photons. The particles
which cause significant soft fails in electronics are
those particles with the strong interaction: neutrons,
protons, and pions. At sea level, about 95\% of these
particles are neutrons. The quantitative flux of
neutrons can be estimated to within $3\times$, and the
relative variation in neutron flux with latitude,
altitude, diurnal time, earth's sidereal position, and
solar cycle is known with even higher accuracy. The
possibility of two particles of a cascade interacting
with a single circuit to cause two simultaneous errors
is discussed. The terrestrial flux of nucleons can be
attenuated by shielding, making a significant reduction
in the electronic system soft-error rate. Estimates of
such attenuation are made.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B2570 (Semiconductor integrated
circuits); B5230 (Electromagnetic compatibility and
interference)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "altitude; analysis; cosmic ray interactions; diurnal
time; electron beam effects; electrons; failure;
integrated circuit reliability; latitude; muons;
neutron effects; neutrons; photons; pions; proton
effects; protons; quantitative flux; shielding;
sidereal position; simultaneous errors; soft fails;
soft-error rate; solar cycle; terrestrial cosmic rays;
terrestrial electronics; terrestrial flux",
treatment = "G General Review; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{OGorman:1996:FTC,
author = "T. J. O'Gorman and J. M. Ross and A. H. Taber and J.
F. Ziegler and H. P. Muhlfeld and C. J. Montrose and H.
W. Curtis and J. L. Walsh",
title = "Field testing for cosmic ray soft errors in
semiconductor memories",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "41--50",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#four",
abstract = "This paper presents a review of experiments performed
by IBM to investigate the causes of soft errors in
semiconductor memory chips under field test conditions.
The effects of alpha-particles and cosmic rays are
separated by comparing multiple measurements of the
soft-error rate (SER) of samples of memory chips deep
underground and at various altitudes above the earth.
The results of case studies on four different memory
chips show that cosmic rays are an important source of
the ionizing radiation that causes soft errors. The
results of field testing are used to confirm the
accuracy of the modeling and the accelerated testing of
chips.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B0170E (Production
facilities and engineering); B2570 (Semiconductor
integrated circuits); B0170N (Reliability)",
corpsource = "IBM Corp., Essex Junction, VT, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "accelerated testing; alpha-particle effects; circuit
reliability; cosmic ray interactions; cosmic ray soft
errors; field; IBM; integrated; integrated circuit
testing; ionizing radiation; life testing; memory
circuits; semiconductor memories; soft-error rate; test
conditions",
treatment = "P Practical; X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ziegler:1996:ATC,
author = "J. F. Ziegler and H. P. Muhlfeld and C. J. Montrose
and H. W. Curtis and T. J. O'Gorman and J. M. Ross",
title = "Accelerated testing for cosmic soft-error rate",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "51--72",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#five",
abstract = "This paper describes the experimental techniques which
have been developed at IBM to determine the sensitivity
of electronic circuits to cosmic rays at sea level. It
relates IBM circuit design and modeling, chip
manufacture with process variations, and chip testing
for SER sensitivity. This vertical integration from
design to final test and with feedback to design allows
a complete picture of LSI sensitivity to cosmic rays.
Since advanced computers are designed with LSI chips
long before the chips have been fabricated, and the
system architecture is fully formed before the first
chips are functional, it is essential to establish the
chip reliability as early as possible. This paper
establishes techniques to test chips that are only
partly functional (e.g., only 1Mb of a 16Mb memory may
be working) and can establish chip soft-error upset
rates before final chip manufacturing begins. Simple
relationships derived from measurement of more than 80
different chips manufactured over 20 years allow total
cosmic soft-error rate (SER) to be estimated after only
limited testing. Comparisons between these accelerated
test results and similar tests determined by `field
testing' (which may require a year or more of testing
after manufacturing begins) show that our experimental
techniques are accurate to a factor of 2.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B0170E (Production facilities
and engineering); B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "accelerated testing; chip manufacture; chip
reliability; chip testing; circuit design; cosmic ray
interactions; cosmic soft-error rate; IBM; integrated
circuit design; integrated circuit reliability;
integrated circuit testing; large scale integration;
life testing; LSI; production testing; sea level;
sensitivity; SER; soft-error rate; soft-error upset
rates",
treatment = "P Practical; X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ziegler:1996:PFC,
author = "J. F. Ziegler and P. A. Saunders and T. H. Zabel",
title = "Portable {Faraday} cup for nonvacuum proton beams",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "73--76",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#six",
abstract = "A portable Faraday cup design is described for the
accurate measurement of large-diameter, low-current,
and high-energy proton beams traveling in air. The unit
has been tested with protons from 4 to 300 MeV. The
unit has an accuracy of 10\% for beams of 1 pA,
improving to about 2\% accuracy for ion currents of 20
pA to 1 $\mu$A.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A2925F (Beam handling, focusing, pulsing, stripping
and diagnostics); A0620H (Measurement standards and
calibration); A2940 (Radiation detectors); B7410B
(Particle beam handling and diagnostics); B5180D
(Electrostatic devices); B7130 (Measurement standards
and calibration); B7420 (Particle and radiation
detection and measurement)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "1 pA; 20 pA to 1; 4 to 300 MeV; calibration;
diagnostics; electrostatic devices; high-energy; ion
currents; muA; nonvacuum proton beams; particle beam;
portable Faraday cup; proton beams; proton detection",
treatment = "A Application; X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Srinivasan:1996:MCS,
author = "G. R. Srinivasan",
title = "Modeling the cosmic-ray-induced soft-error rate in
integrated circuits: An overview",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "77--89",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#seven",
abstract = "This paper is an overview of the concepts and
methodologies used to predict soft-error rates (SER)
due to cosmic and high-energy particle radiation in
integrated circuit chips. The paper emphasizes the need
for the SER simulation using the actual chip circuit
model which includes device, process, and technology
parameters as opposed to using either the discrete
device simulation or generic circuit simulation that is
commonly employed in SER modeling. Concepts such as
funneling, event-by-event simulation, nuclear history
files, critical charge, and charge sharing are
examined. Also discussed are the relative importance of
elastic and inelastic nuclear collisions, rare event
statistics, and device vs. circuit simulations. The
semi-empirical methodologies used in the aerospace
community to arrive at SERs [also referred to as
single-event upset (SEU) rates] in integrated circuit
chips are reviewed. This paper is one of four in this
special issue relating to SER modeling. Together, they
provide a comprehensive account of this modeling
effort, which has resulted in a unique modeling tool
called the Soft-Error Monte Carlo Model, or SEMM.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570A (Integrated circuit modelling and process
simulation); B1130B (Computer-aided circuit analysis
and design); B0240G (Monte Carlo methods); B0170N
(Reliability); C7410D (Electronic engineering
computing); C1140G (Monte Carlo methods)",
corpsource = "IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "aerospace community; charge sharing; chip; circuit
analysis computing; circuit model; cosmic ray
interactions; cosmic-ray-induced soft-error rate;
critical charge; discrete event simulation; event
simulation; event upset; event-by-; funneling;
high-energy particle; integrated circuit chips;
integrated circuit modelling; integrated circuit
reliability; Monte Carlo methods; nuclear collisions;
nuclear history files; radiation; rare event
statistics; semi-empirical methodologies; SER
simulation; single-; technology parameters",
treatment = "P Practical; T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Tang:1996:NPC,
author = "H. H. K. Tang",
title = "Nuclear physics of cosmic ray interaction with
semiconductor materials: Particle-induced soft errors
from a physicist's perspective",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "91--108",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#eight",
abstract = "The key issues of cosmic-ray-induced soft-error rates,
SER (also referred to as single-event upset, SEU,
rates) in microelectronic devices are discussed from
the viewpoint of fundamental atomic and nuclear
interactions between high-energy particles and
semiconductors. From sea level to moderate altitudes,
the cosmic ray spectrum is dominated by three particle
species: nucleons (protons and neutrons), pions, and
muons. The characteristic features of high-energy
nuclear reactions of these particles with light
elements are reviewed. A major cause of soft errors is
identified to be the ionization electron-hole pairs
induced by the secondary nuclear fragments produced in
certain processes. These processes are the inelastic
collisions between the cosmic ray particles and nuclei
in the host material. A state-of-the-art nuclear
spallation reaction model, NUSPA, is developed to
simulate these reactions. This model is tested and
validated by a large set of nuclear experiments. It is
used to generate the crucial database for the
soft-error simulators which are currently used
throughout IBM for device and circuit analysis. The
relative effectiveness of nucleons, pions, and muons as
soft-error-inducing agents is evaluated on the basis of
nuclear reaction rate calculations and
energy-deposition analysis.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B0170N (Reliability); B2570 (Semiconductor integrated
circuits)",
corpsource = "IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis; circuit reliability; cosmic ray interaction;
cosmic ray interactions; energy-deposition; failure
analysis; high-energy; inelastic collisions;
integrated; ionization electron-hole pairs;
microelectronic devices; muons; neutron effects;
neutrons; nuclear fragments; nuclear reactions; nuclear
spallation; nucleons; particle-induced soft errors;
pions; proton effects; protons; reaction model; sea
level; secondary; SER; single-event upset; soft-error
simulators",
treatment = "P Practical; X Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Murley:1996:SMC,
author = "P. C. Murley and G. R. Srinivasan",
title = "Soft-error {Monte Carlo} modeling program, {SEMM}",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "109--118",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#nine",
abstract = "The application of a computer program, SEMM
(Soft-Error Monte Carlo Modeling), is described. SEMM
calculates the soft-error rate (SER) of semiconductor
chips due to ionizing radiation. Used primarily to
determine whether chip designs meet SER specifications,
the program requires detailed layout and process
information and circuit Q values.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570A (Integrated circuit modelling and process
simulation); B0240G (Monte Carlo methods); B0170N
(Reliability); C7410D (Electronic engineering
computing); C1140G (Monte Carlo methods)",
corpsource = "IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Carlo methods; chip designs; circuit modelling;
circuit Q/sub crit/ values; failure analysis;
integrated; integrated circuit layout; integrated
circuit reliability; ionizing radiation; layout
information; Monte; process information; radiation
effects; semiconductor chips; SEMM; SER; soft-error
Monte Carlo modeling; soft-error rate; specifications",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Freeman:1996:CCC,
author = "L. B. Freeman",
title = "Critical charge calculations for a bipolar {SRAM}
array",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "119--129",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-1.html#ten",
abstract = "The critical charge, Q, of a memory array storage cell
is defined as the largest charge that can be injected
without changing the cell's logic state. The Q of a
Schottky-coupled complementary bipolar SRAM array is
evaluated in detail. An operational definition of
critical charge is made, and the critical charge for
the cell is determined by circuit simulation. The
dependence of critical charge on upset-pulse wave
shape, statistical variations of power supply voltage,
temperature gradients, manufacturing process
tolerances, and design-related influences due to word-
and drain-line resistance was also calculated. A
$2\times$ range in Q is obtained for the SRAM memory
array cell from simulations of normal ($\pm 3$)
variations in manufacturing process tolerances, the
shape of the upset current pulse, and local cell
temperatures. Using SEMM, a $60\times$ variation of the
soft-error rate (SER) is obtained for this range in Q.
The calculated SER is compared to experimental values
for the chip obtained by accelerated testing. It is
concluded that a range in values of the critical charge
of a cell due to normal manufacturing and operating
tolerances must be considered when calculating
soft-error rates for a chip.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265D (Memory circuits); B2570B (Bipolar integrated
circuits); B1130B (Computer-aided circuit analysis and
design); B0170E (Production facilities and
engineering); C7410D (Electronic engineering
computing); C5320G (Semiconductor storage)",
corpsource = "IBM Corp., East Fishkill, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "accelerated testing; array; array storage cell;
bipolar memory circuits; bipolar SRAM array; cellular
arrays; circuit analysis; circuit simulation;
computing; critical charge calculations; design-related
influences; digital simulation; drain-line resistance;
integrated circuit design; integrated circuit testing;
life testing; local cell temperatures; manufacturing
process; memory; power; radiation effects; rate;
Schottky-coupled complementary bipolar; soft-error;
SRAM chips; supply voltage; temperature gradients;
tolerances; upset-pulse wave shape; word-line
resistance",
treatment = "P Practical; T Theoretical or Mathematical; X
Experimental",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "131--??",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 17 09:24:33 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "1",
pages = "133--??",
month = jan,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 17 09:24:33 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Hauge:1996:PSA,
author = "P. Hauge",
title = "Papers on Services, Applications, and Solutions:
Preface",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "138--138",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Mintzer:1996:TOW,
author = "F. C. Mintzer and L. E. Boyle and A. N. Cazes and B.
S. Christian and S. C. Cox and F. P. Giordano and H. M.
Gladney and M. L. Kelmanson and A. C. Lirani and K. A.
Magerlein and A. M. B. Pavani and F. Schiattarella",
title = "Toward on-line, worldwide access to {Vatican Library}
materials",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "139--162",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#two",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7210L (Library automation); C7250 (Information
storage and retrieval); C7210 (Information services and
centres); C5620W (Other computer networks)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "digital library services; information retrieval;
information services; Internet; library automation;
manuscripts; misappropriation; multiserver system;
online access; printed books; rare books; Vatican
Library materials; worldwide access",
treatment = "P Practical",
xxauthor = "F. C. Mintzer and L. E. Boyle and A. N. Cazes and B.
S. Christian and S. C. Cox and F. P. Giordano and H. M.
Gladney and J. C. Lee and M. L. Kelmanson and A. C.
Lirani and K. A. Magerlein and A. M. B. Pavani and F.
Schiattarella",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Taylor:1996:OCI,
author = "R. H. Taylor and J. Funda and L. Joskowicz and A. D.
Kalvin and S. H. Gomory and A. P. Gueziec and L. M. G.
Brown",
title = "An overview of computer integrated surgery at the {IBM
Thomas J. Watson Research Center}",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "163--183",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#three",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7330 (Biology and medical computing); C7140 (Medical
administration)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer integrated surgery; computer-; craniofacial;
medical computing; medical diagnostic computing;
medical modeling; minimally invasive surgery; oriented
research laboratory; orthopaedics; research strategy;
surgery",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Ohbuchi:1996:IMS,
author = "R. Ohbuchi and T. Miyazawa and M. Aono and A. Koide
and M. Kimura and R. Yoshida",
title = "Integrated medical-image system for cancer research
and treatment",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "185--210",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#four",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "A8770E (Patient diagnostic methods and
instrumentation); A8770G (Patient care and treatment);
B7510B (Radiation and radioactivity applications in
biomedicine); B7520C (Radiation therapy); C7330
(Biology and medical computing); C5260B (Computer
vision and image processing techniques); C6160S
(Spatial and pictorial databases); C7140 (Medical
administration)",
corpsource = "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "3D medical images visualisation; anatomy viewer;
cancer research and; computed tomography;
computer-assisted diagnosis; computerised tomography;
data visualisation; environment technology;
heterogeneous network of supercomputers; integrated
medical image system; medical image; medical
information systems; medical-image database;
neurosurgery simulator; patient treatment;
patient-record database; personal computers;
processing; protein databases; synthetic-; treatment;
ultrasound echography equipment; visual databases;
workstations,; X-ray",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
xxtitle = "Integrated medical-image system for cancer research
treatment",
}
@Article{Gopisetty:1996:AFS,
author = "S. Gopisetty and R. Lorie and J. Mao and M. Mohluddin
and A. Sorin and E. Yair",
title = "Automated forms-processing software and services",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "211--230",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#five",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7100 (Business and administration); C5260B (Computer
vision and image processing techniques); C5530 (Pattern
recognition and computer vision equipment); C6160S
(Spatial and pictorial databases); C1250B (Character
recognition)",
corpsource = "IBM Almaden Res. Center, San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "automated forms-processing software; business forms;
contextual checking; document image processing;
document-image systems; form recognition; intelligent
character; machine reading; optical character;
productivity improvements; recognition; scanned images;
software packages; software system",
treatment = "A Application; P Practical",
xxauthor = "S. Gopisetty and R. Lorie and J. Mao and M. Mohiuddin
and A. Sorin and E. Yair",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Lee:1996:PPS,
author = "H. S. Lee and S. S. Murthy and S. W. Haider and D. V.
Morse",
title = "Primary production scheduling at steelmaking
industries",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "231--252",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#six",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7480 (Production engineering computing); C1230
(Artificial intelligence); C1290F (Systems theory
applications in industry); C3350C (Control applications
in metallurgical industries)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "artificial intelligence; business objectives;
computerized scheduling; control; operations;
operations research; primary production scheduling;
production; research; steel industry; steelmaking
industries",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Coppersmith:1996:PMT,
author = "D. Coppersmith and D. B. Johnson and S. M. Matyas",
title = "A proposed mode for triple {DES} encryption",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "253--262",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-2.html#seven",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6120B (Codes); C6130S (Data security)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "ANSI standards; ANSI X9.F.1 triple-DES draft;
cryptography; external feedback cipher block chaining;
feedback; masking; multiple encryption-triple-DES;
output feedback; secret masking values; standard;
triple DES encryption; X9.52",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "263--??",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 16 13:12:40 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "2",
pages = "275--??",
month = mar,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 16 13:12:40 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Chiu:1996:TFI,
author = "A. Chiu and I. Croll and D. E. Heim and R. E. {Jones,
Jr.} and P. Kasiraj and K. B. Klaassen and C. D. Mee
and R. G. Simmons",
title = "Thin film inductive heads",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "283--300",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-3.html#one",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B3120N (Magnetic thin
film devices)",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "devices; head; head noise; heads; IBM thin-film
inductive recording heads; instabilities; magnetic
heads; magnetic recording noise; magnetic thin film;
multi-turn; signal instability; single-turn heads;
technology materials; thin-film; thin-film processes",
treatment = "G General Review; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Kishi:1996:IRV,
author = "G. T. Kishi",
title = "The {IBM} 3495 robotics and vision system",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "301--310",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-3.html#two",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5690 (Other data communication equipment and
techniques); C1250 (Pattern recognition); C5260B
(Computer vision and image processing techniques);
C1230D (Neural nets); C5630 (Networking equipment)",
corpsource = "IBM Storage Syst. Div., Tucson, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application programs; automated tape library;
automatic teaching; command queueing; continuous
robotic; Dataserver; Drive Subsystems; enclosure; file
servers; IBM 3490 Magnetic Tape; IBM 3495 robotics and
vision system; IBM 3495 Tape Library; IBM computers;
Library Manager computer; magnetic tape storage;
motion; nets; neural; neural network; performance
penalty; robot vision; storage; tape cartridge
accessor",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{McDaniel:1996:ODS,
author = "T. W. McDaniel and P. C. Arnett",
title = "Optical data storage media",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "311--330",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-3.html#three",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320K (Optical storage)",
corpsource = "IBM Storage Syst. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "addressing; birefringence; data; data archivability;
embossed data; geometric design; grooves; low
substrate; mechanical integrity; media thin-film
structure; optical data storage media; optical disk;
optical drive; optical information processing; optical
storage; recording media; robust data seeking;
technical issues; track following",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Burton:1996:SCC,
author = "D. A. Burton and B. McNutt",
title = "Storage control cache resource management: Increasing
diversity, increasing effectiveness",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "331--340",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-3.html#four",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C6120 (File organisation); C5320G (Semiconductor
storage)",
corpsource = "IBM Storage Syst. Div., Tuscon, AZ, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "cache storage; cached; caching algorithms;
controllers; storage control cache resource management;
storage management",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Yamashita:1996:DRS,
author = "A. Yamashita and T. Amano and Y. Hirayama and N. Itoh
and S. Katoh and T. Mano and K. Toyokawa",
title = "A document recognition system and its applications",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "341--352",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-3.html#five",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B6140C (Optical information, image and video signal
processing); C1250 (Pattern recognition); C5260B
(Computer vision and image processing techniques)",
corpsource = "Toyko Res. Lab, IBM Res. Div., Kanagawa, Japan",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "adapter card; blob detection; block; character
recognition; data; database; document entry system;
document image processing; document recognition system;
documents; electronic catalog; electronic form; family
registration data; functions; image segmentation;
Japanese postprocessing; Kanji characters; layout
analysis functions; management; model matching;
modules; object-oriented management; personal computer;
printed; processing; records; segmentation; tag; text;
user interface",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "353--??",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 16 13:12:40 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "3",
pages = "367--??",
month = may,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 16 13:12:40 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Hsieh:1996:PIA,
author = "E. P. Hsieh and M. D. O'Neill",
title = "Preface: {IBM ASIC} Design and Testing",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "376--376",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#one",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Bednar:1996:TAL,
author = "T. R. Bednar and R. A. Piro and D. W. Stout and L.
Wissel and P. S. Zuchowski",
title = "Technology-migratable {ASIC} library design",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "377--386",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#two",
abstract = "A library strategy has been developed to enable IBM
Microelectronics ASIC development to keep pace with
rapid technology enhancements and to offer leading-edge
performance to ASIC customers. Library elements are
designed using migratable design rules to allow designs
to be reused in future advanced technologies; and
library contents, design methodology, test methodology,
and packaging offerings for the ASICs also are
consistent between current and future technologies. The
benefit to the ASIC customer is an ASIC with a rich
library of logic functions, arrays, and I/Os for
today's designs, and with a ready migration path into
future designs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265 (Digital electronics); B1285 (Analogue
processing circuits); B1280 (Mixed analogue-digital
circuits); B1130B (Computer-aided circuit analysis and
design); B0170E (Production facilities and
engineering); B0170J (Product packaging); C7410D
(Electronic engineering computing)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits; circuit CAD;
design methodology; IBM; integrated circuit design;
integrated circuit packaging; integrated circuit
testing; leading-edge performance; library contents;
Microelectronics ASIC development; packaging; software
libraries; technology-migratable ASIC library design;
test methodology",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Engel:1996:DMI,
author = "J. J. Engel and T. S. Guzowski and A. Hunt and D. E.
Lackey and L. D. Pickup and R. A. Proctor and K.
Reynolds and A. M. Rincon and D. R. Stauffer",
title = "Design methodology for {IBM ASIC} products",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "387--406",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#three",
abstract = "The IBM ASIC design methodology enables a product
developer to fully incorporate the high-density,
high-performance capabilities of the IBM CMOS
technologies in the design of leading-edge products.
The methodology allows the full exploitation of
technology density, performance, and high testability
in an ASIC design environment. The IBM ASIC design
methodology builds upon years of experience within IBM
in developing design flows that optimize performance,
testability, chip density, and time to market for
internal products. It has also been achieved by using
industry-standard design tools and system design
approaches, allowing IBM ASIC products to be marketed
externally as well as to IBM internal product
developers. This paper describes the IBM ASIC design
methodology, and then focuses on the key areas of the
methodology that enable a customer to exploit the
technology in terms of performance, density, and
testability, all in a fast-time-to-market ASIC
paradigm. Also emphasized are aspects of the
methodology that allow IBM to market its design
experience and intellectual property.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570D (CMOS integrated circuits); B1130B
(Computer-aided circuit analysis and design); B1265
(Digital electronics); C7410D (Electronic engineering
computing)",
corpsource = "Microelecton. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits;
capabilities; chip density; circuit CAD; circuit
design; circuit optimisation; CMOS integrated circuits;
CMOS technologies; high-density high-performance; IBM
ASIC design methodology; integrated; optimization;
performance; technology density; technology
performance; testability; testability optimization",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Stok:1996:BLS,
author = "L. Stok and D. S. Kung and D. Brand and A. D. Drumm
and A. J. Sullivan and L. N. Reddy and N. Hieter and D.
J. Geiger and H. H. Chao and P. J. Osler",
title = "{BooleDozer}: Logic synthesis for {ASICs}",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "407--430",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#four",
abstract = "Logic synthesis is the process of automatically
generating optimized logic-level representation from a
high-level description. With the rapid advances in
integrated circuit technology and the resultant growth
in design complexity, designers increasingly rely on
logic synthesis to shorten the design time while
achieving performance objectives. This paper describes
the IBM logic synthesis system BooleDozer*, including
its organization, main algorithms, and how it fits into
the design process. The BooleDozer logic synthesis
system has been widely used within IBM to successfully
synthesize processor and ASIC designs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265 (Digital electronics); C7410D (Electronic
engineering computing); C5210B (Computer-aided logic
design); C4210 (Formal logic)",
corpsource = "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
Heights, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits; ASIC;
Boolean functions; BooleDozer; complexity; design;
high-; integrated circuit technology; ISM logic
synthesis system; level description; logic CAD;
optimized logic-level representation",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Sayah:1996:DPH,
author = "J. Y. Sayah and R. Gupta and D. D. Sherlekar and P. S.
Honsinger and J. M. Apte and S. W. Bollinger and H. H.
Chen and S. DasGupta and E. P. Hsieh and A. D. Huber
and E. J. Hughes and Z. M. Kurzum and V. B. Rao and T.
Tabtieng and V. Valijan and D. Y. Yang",
title = "Design planning for high performance {ASICs}",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "431--452",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#five",
abstract = "Design planning is emerging as a solution to some of
the most difficult challenges of the deep-submicron
VLSI design era. Reducing design turnaround time for
extremely large designs with ever-increasing clock
speeds, while ensuring first-pass implementation
success, is exhausting the capabilities of traditional
design tools. To solve this problem, we have designed
and implemented a hierarchical design planning system
that consists of a tightly integrated set of design and
analysis tools. The integrated run-time environment,
with its rich set of hierarchical, timing-driven design
planning and implementation functions, provides an
advanced platform for realizing a variety of ASIC and
custom methodologies. One of the system's particular
strengths is its tight integration with an incremental,
static timing engine that assists in achieving timing
closure in high-performance designs. The design planner
is in production use at IBM internal and at external
ASIC design centers.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1280 (Mixed analogue-digital circuits); C7410D
(Electronic engineering computing)",
corpsource = "Microelectron. Div., IBM Corp., Hopewell Junction, NY,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "analysis tools; application specific integrated
circuits; circuit CAD; deep-submicron; design and;
design planning; hierarchical design planning system;
high performance ASICs; timing-driven design planning;
VLSI",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Hathaway:1996:CPC,
author = "D. J. Hathaway and R. R. Habra and E. C. Schanzenbach
and S. J. Rothman",
title = "Circuit placement, chip optimization, and wire routing
for {IBM IC} technology",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "453--460",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#six",
abstract = "Recent advances in integrated circuit technology have
imposed new requirements on the chip physical design
process. At the same time that performance requirements
are increasing, the effects of wiring on delay are
becoming more significant. Larger chips are also
increasing the chip wiring demand, and the ability to
efficiently process these large chips in reasonable
time and space requires new capabilities from the
physical design tools. Circuit placement is done using
algorithms which have been used within IBM for many
years, with enhancements as required to support
additional technologies and larger data volumes. To
meet timing requirements, placement may be run
iteratively using successively refined timing-derived
constraints. Chip optimization tools are used to
physically optimize the clock trees and scan
connections, both to improve clock skew and to improve
wirability. These tools interchange sinks of equivalent
nets, move and create parallel copies of clock buffers,
add load circuits to balance clock net loads, and
generate balanced clock tree routes. Routing is done
using a grid-based, technology-independent router that
has been used over the years to wire chips. There are
numerous user controls for specifying router behavior
in particular areas and on particular interconnection
levels, as well as adjacency restrictions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B2570 (Semiconductor integrated circuits); B1130B
(Computer-aided circuit analysis and design); B0260
(Optimisation techniques); C7410D (Electronic
engineering computing); C1180 (Optimisation
techniques)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "chip optimization; chip wiring; circuit layout CAD;
circuit optimisation; circuit placement; clock buffers;
clock trees; demand; IBM IC; independent router;
integrated circuit; integrated circuit technology; scan
connections; technology; technology-; timing
requirements; timing-derived constraints; wire
routing",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Gillis:1996:TMD,
author = "P. S. Gillis and T. S. Guzowski and B. L. Keller and
R. H. Kerr",
title = "Test methodologies and design automation for {IBM
ASICs}",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "461--474",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#seven",
abstract = "IBM manufactures a very large number of different
application-specific integrated circuit (ASIC) chips
each year. Although these chips are designed by many
different customers having various levels of test
experience and all having tight deadlines, IBM ASICs
have a reputation for their high quality. This quality
is due in large part to the heavy focus on design for
test (DFT) and the use of design automation to help
ensure that customers' chips can be manufactured,
tested, and diagnosed with minimal engineering effort.
Prospective customers of IBM ASIC technologies find an
explicit set of DFT methodologies to follow which
provide a relatively painless, almost push-button
approach to the generation of high-quality,
``sign-off'' test vectors for their chips. This paper
discusses the DFT methodologies used for IBM ASICs and
the design automation support that enables designers to
be so productive with these methodologies. Data are
given for several recently processed chips, some
designed outside IBM.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1130B (Computer-aided circuit analysis and design);
B1265B (Logic circuits); B1280 (Mixed analogue-digital
circuits); B2570 (Semiconductor integrated circuits);
C7410D (Electronic engineering computing); C5210 (Logic
design methods)",
corpsource = "Microelectron. Div., IBM Corp., Essex Junction, VT,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits; ASICs;
circuit CAD; design automation; high quality; IBM
ASICs; logic; methodologies; test; testing",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Poli:1996:ITA,
author = "D. J. Poli and M. S. Berry and J. N. Kruchowski",
title = "{IC} technology and {ASIC} design for the {Cray J90}
supercomputer",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "475--483",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#eight",
abstract = "The decision to use ASIC technology over a full- or
semi-custom approach in the design of a computer system
is influenced by many factors, and has a significant
impact on the design methodology as well as on the
completion schedule of the product. The Cray Research
J90* line of 100-MHz supercomputer systems is an
example of a system whose performance, cost, and
schedule needs drove the designers to an ASIC solution.
The J90 comprises varying numbers of ten unique ASICs,
each designed in a 0.5-$\mu$m CMOS technology. The
largest of the ASICs contains more than 500,000
equivalent two-way NAND CMOS gates. The design cycle,
including integrated circuit and first-level packaging
technology selection, took just over two years from
concept to production. This paper presents a brief
history of the Cray ELS (Entry-Level Systems) division
and discusses some of the decision processes and
trade-offs made during the design of the J90 system,
including the decision to use ASIC technology, and its
effect on the overall design methodology and CAD flow.
The design methodology, which utilized a
ground-rule-based HDL/synthesis approach, and the
physical design of the chips, which made use of
industry-standard and vendor-proprietary tools, are
discussed. Finally, conclusions as to the applicability
and the success of utilizing an ``off-the-shelf'' ASIC
technology are drawn.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5220 (Computer architecture); C5420 (Mainframes and
minicomputers)",
corpsource = "Cray Res. Inc., Chippewa Falls, MN, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "application specific integrated circuits;
architecture; ASIC design; ASIC solution; computer;
Cray; Cray computers; Cray J90 supercomputer; IC
technology; multiprocessing systems; Research J90",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Gianos:1996:DCD,
author = "C. Gianos and D. Hobson",
title = "Design considerations for {Digital's PowerStorm}
graphics processor",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "485--494",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#nine",
abstract = "The specific development goals for the Digital
Equipment Corporation PowerStorm*** graphics processor
were improved performance, low product cost, quick time
to market, and backward compatibility with existing
user software. Achieving these goals required the
evaluation and implementation of many new features,
enhancements to the existing architecture, and improved
development techniques. This paper describes several of
the more notable aspects that were considered and
includes a discussion of how the underlying technology
played a role in meeting the product goals.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5130 (Microprocessor chips); C5540 (Terminals and
graphic displays)",
corpsource = "Digital Equipment Corp., Maynard, MA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "backward compatibility; computer graphic equipment;
coprocessors; Corporation; DEC computers; Digital
Equipment; performance; PowerStorm graphics processor;
product cost; time to market",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Bishop:1996:PAB,
author = "J. W. Bishop and M. J. Campion and T. L. Jeremiah and
S. J. Mercier and E. J. Mohring and K. P. Pfarr and B.
G. Rudolph and G. S. Still and T. S. White",
title = "{PowerPC AS A10} 64 bit {RISC} microprocessor",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "495--505",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html#10",
abstract = "The PowerPC AS* A10 64-bit RISC microprocessor is a
4.7-million-transistor integrated circuit design, using
IBM CMOS 5L 0.5-$\mu$m, 3-V, four-level-metal ASIC
technology. Support for the PowerPC AS architecture is
implemented in a 213-mm$^2$ die using a semicustom
design methodology. Chip density and speed are enhanced
through the use of custom macros and multiport arrays.
An on-chip phase-locked-loop circuit is used to reduce
chip-to-chip clock skew. Full utilization of the
four-level-metal interconnect technology was achieved
through architectural floorplanning, performance
clustering, and timing-driven placement and wiring,
with a total wire length of over 102 meters placed on
the 14.6 $\times$ 14.6-mm die. The microprocessor is a
pipelined, superscalar design with five separate
functional units, a 4KB instruction cache, and an 8KB
data cache. The design includes parity,
error-correction, and error-logging functions, as well
as self-test for logic and arrays during power-on. The
design is robust and implements a wide range of
performance configurations at the system level,
allowing direct attachment of DRAM to the processor, or
high-performance L2 cache options using high-speed
SRAM. An on-chip system I/O bus and bus controller are
provided for attachment of peripherals.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); B2570D
(CMOS integrated circuits); C5130 (Microprocessor
chips); C5220 (Computer architecture)",
corpsource = "AS/400 Div., IBM Corp., Endicott, NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "4KB; 8KB data cache; application specific integrated
circuits; architectural floorplanning; ASIC; bus
controller; circuits; CMOS integrated; computing;
custom macros; driven placement; error-correction;
error-logging functions; four-level-metal interconnect
technology; high-; IBM CMOS 5L; instruction cache; loop
circuit; microprocessor chips; multiport arrays;
on-chip system I/O bus; parity; performance clustering;
performance configurations; phase-locked-; PowerPC AS
A10 64 bit RISC microprocessor; reduced instruction
set; speed SRAM; superscalar design; technology;
timing-; wiring",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pd,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "4",
pages = "507--??",
month = jul,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 20 13:32:50 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-4.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Johnson:1996:TMF,
author = "K. E. Johnson and C. M. Mate and J. A. Merz and R. L.
White and A. W. Wu",
title = "Thin-film media --- Current and future technology",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "511--536",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-5.html#one",
abstract = "In the last ten years, the fundamental technology of
recording media has evolved from particulate to thin
film. The introduction of magnetoresistive heads in
1990 has had further impact on the design of thin-film
media. Changes in substrates, magnetic films,
overcoats, and lubrication form the basis of the
evolution. Design concepts and manufacturing
considerations for high-areal-density thin-film disks
are described in this paper, with reflections on future
enhancements required for media of the next
generation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B2220E (Thin film
circuits); C5320C (Storage on moving magnetic media)",
corpsource = "Storage Syst. Div. Lab., IBM Corp., San Jose, CA,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "circuits; lubrication; magnetic disc storage; magnetic
films; magnetic thin films; magnetoresistive heads;
overcoats; recording media; substrates; thin film;
thin-film media",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Schlatter:1996:CTA,
author = "B. Schlatter",
title = "Computer-aided {3D} tolerance analysis of disk
drives",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "537--542",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-5.html#two",
abstract = "Disk drives are multicomponent products in which
product build variations directly affect quality.
Dimensional management, an engineering methodology
combined with software tools, was implemented in disk
drive development engineering at IBM in San Jose to
predict and optimize critical parameters in disk
drives. It applies statistical simulation techniques to
predict the amount of variation that can occur in the
disk drive due to the specified design tolerances,
fixturing tolerances, and assembly variations. This
paper presents statistics describing the measurement
values produced during simulations, a histogram showing
the measurement values graphically, and an analysis of
the process capability, C [p][k] to ensure robust
designs. Additionally, it describes how modeling can
determine the location(s) of the predicted variation,
the contributing factors, and their percent of
contribution. Although a complete 2.5-in. disk drive
was modeled and all critical variations such as
suspension-to-disk gaps, disk-stack envelope, and merge
clearances were analyzed, this paper presents for
illustration only one critical disk real estate
parameter. The example shows the capability of this
methodology. VSA-3D software by Variation Systems
Analysis was used.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C6115
(Programming support)",
corpsource = "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analysis; assembly; computer-aided 3D tolerance
analysis; critical disk; critical parameters;
dimensional management; disk drives; engineering;
fixturing tolerances; histogram; magnetic disc storage;
methodology; multicomponent products; process
capability; real estate parameter; software tools;
statistical simulation; tolerance analysis; Variation
Systems; variations; VSA-3D software",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Asthana:1996:ROD,
author = "P. Asthana and B. I. Finkelstein and A. A. Fennema",
title = "Rewritable optical disk drive technology",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "543--558",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-5.html#three",
abstract = "Optical disk drives provide an effective solution to
the growing need for removable high-capacity storage.
In this paper, we review the technology behind the
optical disk drives used in IBM's optical storage
systems. The basic physics of data recording and
readout and the engineering of the primary building
blocks of an optical drive (the optical head, the servo
system, and the data channel) are discussed. We also
outline the technological directions of future optical
drives as they must continue to improve in performance
and capacity.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B4120 (Optical storage and retrieval); B3120B
(Magnetic recording); C5320K (Optical storage)",
corpsource = "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "capacity; capacity storage; data; data channel; data
recording; IBM's optical storage systems; optical disc
storage; optical head; performance; recording;
removable high-; rewritable optical disk drive
technology; servo system",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Jessani:1996:FPU,
author = "R. M. Jessani and C. H. Olson",
title = "The floating point unit of the {PowerPC 603e}
microprocessor",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "559--566",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-5.html#four",
abstract = "The IBM PowerPC 603e* floating-point unit (FPU) is an
on-chip functional unit to support IEEE 754 standard
single- and double-precision binary floating-point
arithmetic operations. The design objectives are to be
a low-cost, low-power, high-performance engine in a
single-chip superscalar microprocessor. Using less than
15 mm$^{2}$ of the available silicon area on the chip
(the size of the PowerPC 603e microprocessor is 98
mm$^{2}$) and operating at the peak clock frequency of
100 MHz, an average single-pumping multiply-add-fuse
instruction has one-cycle throughput and four-cycle
latency. An average double-pumping multiply-add-fuse
instruction has two-cycle throughput and five-cycle
latency. The estimated performance at 100 MHz is 105
against the SPECfp92** benchmark.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265F (Microprocessors and microcomputers); C5130
(Microprocessor chips); C5230 (Digital arithmetic
methods)",
corpsource = "Somerset Design Center, Motorola Inc., Austin, TX,
USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "add-fuse instruction; design objectives; digital
arithmetic; double-pumping multiply-add-fuse; floating
point unit; functional unit; IEEE 754 standard;
instruction; microprocessor chips; on-chip; peak clock
frequency; PowerPC 603e microprocessor; silicon area;
single-pumping multiply-",
treatment = "A Application; P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "567--??",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Nov 30 11:49:46 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pe,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "5",
pages = "585--??",
month = sep,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Nov 30 11:49:53 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Judd:1996:SSA,
author = "I. D. Judd and P. J. Murfet and M. J. Palmer",
title = "{Serial Storage Architecture}",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "591--602",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-6.html#one",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5610P (Peripheral interfaces); C5320 (Digital
storage)",
corpsource = "IBM Storage Syst. Div., Havant, UK",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer architecture; digital storage; dual-port SSA
node; evaluation; hardware; high-; implementation;
input output devices; performance; performance serial
link; peripheral interfaces; Serial Storage
Architecture; specification; SSA",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Cheng:1996:FHR,
author = "J.-M. Cheng and L. M. Duyanovich and D. J. Craft",
title = "A fast, highly reliable data compression chip and
algorithm for storage systems",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "603--613",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-6.html#two",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C5320C (Storage on moving magnetic media); C5320G
(Semiconductor storage)",
corpsource = "IBM Storage Syst. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "algorithm; data compression; data compression chip;
data flow analysis; data flows; graph; hardware
execution; IBM; IBM computers; IBMLZ1 compression;
magnetic disc storage; match-length distribution;
overhead; pattern matching; storage management chips;
storage systems; system-integration; vertex coloring",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Kan:1996:PPR,
author = "T. Kan and D. B. Lawson and O. J. Ruiz and C. F.
Sermon",
title = "The past and present roles of computer-aided
engineering in {DASD} design",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "615--621",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-6.html#three",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B3120B (Magnetic recording); B0290T (Finite element
analysis)C7430 (Computer engineering); C5320C (Storage
on moving magnetic media); C4185 (Finite element
analysis)",
corpsource = "IBM Storage Syst. Div., San Jose, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "computer aided engineering; DASD design; design; FEM;
finite element analysis; finite element modeling;
head/disk assemblies; magnetic disc storage; storage
devices; suspension; thermal deformation problem",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Soult:1996:AVA,
author = "S. S. Soult",
title = "Architectural verification of advanced storage
controllers",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "623--630",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-6.html#four",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "C7430 (Computer engineering); C6110F (Formal methods);
C5320C (Storage on moving magnetic media)",
corpsource = "Abbott Labs., Abbott Critical Care Syst. Div.,
Mountain View, CA, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "advanced storage controllers; architectural
complexity; architectural verification; digital
simulation; direct access storage device; formal;
formal specification; high-performance simulator;
magnetic disc storage; storage management; track data;
TurboSim; verification",
treatment = "P Practical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Schlig:1996:CSC,
author = "E. S. Schlig",
title = "Charge-metering sampling circuits and their
applications",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "631--640",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 25 14:26:59 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd40-6.html#five",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
classcodes = "B1265H (A/D and D/A convertors); B7220 (Signal
processing and conditioning equipment and techniques);
B2570D (CMOS integrated circuits); C5180 (A/D and D/A
convertors)",
corpsource = "IBM Thomas J. Watson Res. Center, Yorktown Heights,
NY, USA",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "active matrix display; analog data line driver;
analogue-digital conversion; charge-metering; CMOS
circuit class; CMOS integrated circuits; DACs;
digital-; driver circuits; sampled analog data;
sampling circuits; signal processing equipment",
treatment = "T Theoretical or Mathematical",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:RPIe,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "641--??",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 6 15:09:10 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Anonymous:1996:Pf,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "40",
number = "6",
pages = "651--??",
month = nov,
year = "1996",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 6 15:09:10 MST 1997",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxlibnote = "Issue missing from UofUtah Marriott Library",
}
@Article{Chiu:1997:OLI,
author = "G. L.-T. Chiu and J. M. Shaw",
title = "Optical lithography: {Introduction}",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "3--6",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:46 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/chiu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Holmes:1997:MDL,
author = "S. J. Holmes and P. H. Mitchell and M. C. Hakey",
title = "Manufacturing with {DUV} lithography",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "7--19",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:46 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/holmes.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ausschnitt:1997:ADP,
author = "C. P. Ausschnitt and A. C. Thomas and T. J.
Wiltshire",
title = "Advanced {DUV} photolithography in a pilot line
environment",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "21--37",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:46 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/ausschnitt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Singh:1997:HNA,
author = "R. N. Singh and A. E. Rosenbluth and G. L.-T. Chiu and
J. S. Wilczynski",
title = "High-numerical-aperture optical designs",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "39--48",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:47 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/singh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rothschild:1997:LWN,
author = "M. Rothschild and A. R. Forte and R. R. Kunz and S. C.
Palmateer and J. H. C. Sedlacek",
title = "Lithography at a wavelength of 193 nm",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "49--55",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:47 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/rothschild.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brunner:1997:ILA,
author = "T. A. Brunner",
title = "Impact of lens aberrations on optical lithography",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "57--67",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/brunner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ito:1997:CAR,
author = "H. Ito",
title = "Chemical amplification resists: {History} and
development within {IBM}",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "69--80",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/ito.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shaw:1997:NPO,
author = "J. M. Shaw and J. D. Gelorme and N. C. LaBianca and W.
E. Conley and S. J. Holmes",
title = "Negative photoresists for optical lithography",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "81--94",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/shaw.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Allen:1997:PNL,
author = "R. D. Allen and G. M. Wallraff and D. C. Hofer and R.
R. Kunz",
title = "Photoresists for 193-nm lithography",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "95--104",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:49 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/allen.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seeger:1997:TFI,
author = "D. E. Seeger and D. C. {La Tulipe, Jr.} and R. R. Kunz
and C. M. Garza and M. A. Hanratty",
title = "Thin-film imaging: {Past}, present, prognosis",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "105--118",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:49 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/seeger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Budd:1997:DAN,
author = "R. A. Budd and D. B. Dove and J. L. Staples and R. M.
Martino and R. A. Ferguson and J. T. Weed",
title = "Development and application of a new tool for
lithographic mask evaluation, the stepper equivalent
{Aerial Image Measurement System}, {AIMS}",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "119--129",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:50 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/budd.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Doany:1997:LFS,
author = "F. E. Doany and T. Ainsworth and N. Bobroff and D.
Goodman and A. E. Rosenbluth",
title = "Large-field scanning laser ablation system",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "131--142",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:50 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/doany.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Speidell:1997:MLA,
author = "J. L. Speidell and D. P. Pulaski and R. S. Patel",
title = "Masks for laser ablation technology: {New}
requirements and challenges",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "143--149",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:51 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/speidell.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Doany:1997:LRP,
author = "F. E. Doany and C. Narayan",
title = "Laser release process to obtain freestanding
multilayer metal-polyimide circuits",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "151--157",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:51 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/narayan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Biebuyck:1997:LBL,
author = "H. A. Biebuyck and N. B. Larsen and E. Delamarche and
B. Michel",
title = "Lithography beyond light: {Microcontact} printing with
monolayer resists",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "159--170",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:51 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/biebuyck.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gupta:1997:FEA,
author = "A. Gupta",
title = "Fast and effective algorithms for graph partitioning
and sparse-matrix ordering",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "171--183",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:52 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/gupta.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "185--??",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:37:50 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "41",
number = "1/2",
pages = "195--??",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:37:50 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/411/patents.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bose:1997:PPP,
author = "Pradip Bose",
title = "Preface: Papers on Performance Analysis and Its Impact
on Design",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "203--204",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd/413/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
xxpages = "204--??",
}
@Article{Kaeli:1997:PAC,
author = "D. R. Kaeli and L. L. Fong and R. C. Booth and K. C.
Imming and J. P. Weigel",
title = "Performance analysis on a {CC-NUMA} prototype",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "205--214",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/kaeli.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Emma:1997:USS,
author = "P. G. Emma",
title = "Understanding some simple processor-performance
limits",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "215--232",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
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acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sarkar:1997:ASH,
author = "V. Sarkar",
title = "Automatic selection of high-order transformations in
the {IBM XL FORTRAN} compilers",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "233--264",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/sarkar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Charney:1997:PMS,
author = "M. J. Charney and T. R. Puzak",
title = "Prefetching and memory system behavior of the {SPEC95}
benchmark suite",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "265--286",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
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acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Moreno:1997:SEE,
author = "J. H. Moreno and M. Moudgill and K. Ebcioglu and E.
Altman and C. B. Hall and R. Miranda and S.-K. Chen and
A. Polyak",
title = "Simulation\slash evaluation environment for a {VLIW}
processor architecture",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "287--302",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/moreno.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Moreira:1997:DRM,
author = "J. E. Moreira and V. K. Naik",
title = "Dynamic resource management on distributed systems
using reconfigurable applications",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "303--330",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/moreira.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sandon:1997:NBD,
author = "P. A. Sandon and Y.-C. Liao and T. E. Cook and D. M.
Schultz and P. Martin-de-Nicolas",
title = "{NStrace}: a bus-driven instruction trace tool for
{PowerPC} microprocessors",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "331--344",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/sandon.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Levine:1997:PVP,
author = "F. E. Levine and C. P. Roth",
title = "A programmer's view of performance monitoring in the
{PowerPC} microprocessor",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "345--356",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/levine.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bournas:1997:OTS,
author = "R. M. Bournas",
title = "Optimization of {TCP} segment size for file transfer",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "357--366",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/bournas.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "367--??",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:37:50 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "41",
number = "3",
pages = "379--??",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:37:50 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/413/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mauri:1997:PIG,
author = "Ross A. Mauri",
title = "Preface: {IBM S/390} {G3} and {G4}",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "395--396",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd/414/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rao:1997:IPE,
author = "G. S. Rao and T. A. Gregg and C. A. Price and C. L.
Rao and S. J. Repka",
title = "{IBM S/390 Parallel Enterprise Servers G3} and {G4}",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "397--403",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/rao.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Doettling:1997:PES,
author = "G. Doettling and K. J. Getzlaff and B. Leppla and W.
Lipponer and T. Pflueger and T. Schlipf and D.
Schmunkamp and U. Wille",
title = "{S/390 Parallel Enterprise Server Generation 3}: a
balanced system and cache structure",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "405--428",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/doettling.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mak:1997:SCC,
author = "P. Mak and M. A. Blake and C. C. Jones and G. E.
Strait and P. R. Turgeon",
title = "Shared-cache clusters in a system with a fully shared
memory",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "429--448",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/mak.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gregg:1997:CSC,
author = "T. A. Gregg",
title = "{S/390 CMOS} server {I/O}: The continuing evolution",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "449--462",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/gregg.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webb:1997:HFC,
author = "C. F. Webb and J. S. Liptay",
title = "A high-frequency custom {CMOS S/390} microprocessor",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "463--473",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/webb.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schwarz:1997:CFP,
author = "E. M. Schwarz and L. Sigal and T. J. McPherson",
title = "{CMOS} floating-point unit for the {S/390 Parallel
Enterprise Server G4}",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "475--488",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/schwarz.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sigal:1997:CDT,
author = "L. Sigal and J. D. Warnock and B. W. Curran and Y. H.
Chan and P. J. Camporese and M. D. Mayo and W. V. Huott
and D. R. Knebel and C. T. Chuang and J. P. Eckhardt
and P. T. Wu",
title = "Circuit design techniques for the high-performance
{CMOS IBM S/390 Parallel Enterprise Server G4}
microprocessor",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "489--503",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:10:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/sigal.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kick:1997:SCB,
author = "B. Kick and U. Baur and J. Koehl and T. Ludwig and T.
Pflueger",
title = "Standard-cell-based design methodology for
high-performance support chips",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "505--514",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/kick.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shepard:1997:DMP,
author = "K. L. Shepard and S. M. Carey and E. K. Cho and B. W.
Curran and R. F. Hatch and D. E. Hoffman and S. A.
McCabe and G. A. Northrop and R. Seigler",
title = "Design methodology for the {S/390 Parallel Enterprise
Server G4} microprocessors",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "515--547",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/shepard.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wile:1997:FVC,
author = "B. Wile and M. P. Mullen and C. Hanson and D. G. Bair
and K. M. Lasko and P. J. Duffy and E. J. {Kaminski,
Jr.} and T. E. Gilbert and S. M. Licker and R. G.
Sheldon and W. D. Wollyung and W. J. Lewis and R. J.
Adkins",
title = "Functional verification of the {CMOS S/390 Parallel
Enterprise Server G4} system",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "549--566",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/mullen.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schlipf:1997:FVM,
author = "T. Schlipf and T. Buechner and R. Fritz and M. Helms
and J. Koehl",
title = "Formal verification made easy",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "567--576",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/schlipf.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koerner:1997:RCS,
author = "S. Koerner and S. M. Licker",
title = "Run-control and service element code simulation for
the {S/390} microprocessor",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "577--580",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/koerner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wile:1997:DLV,
author = "B. Wile",
title = "Designer-level verification using {TIMEDIAG/GENRAND}",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "581--591",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/wile.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{VanHuben:1997:RTC,
author = "Gary A. {Van Huben}",
title = "The role of two-cycle simulation in the {S/390}
verification process",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "593--599",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/vanhuben.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hallock:1997:SCP,
author = "G. G. Hallock and E. J. {Kaminski, Jr.} and K. M.
Lasko and M. P. Mullen",
title = "{SimAPI} --- a common programming interface for
simulation",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "601--610",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/hallock.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Huott:1997:AMT,
author = "W. V. Huott and T. J. Koprowski and B. J. Robbins and
M. P. Kusko and S. V. Pateras and D. E. Hoffman and T.
G. McNamara and T. J. Snethen",
title = "Advanced microprocessor test strategy and
methodology",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "611--627",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/huott.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "629--637",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "41",
number = "4/5",
pages = "641--??",
month = "????",
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:37:50 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/414/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zable:1997:OIP,
author = "J. L. Zable and H.-C. Lee",
title = "An overview of impact printing",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "651--668",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/zable.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stanich:1997:PQE,
author = "M. J. Stanich",
title = "Print-quality enhancement in electrophotographic
printers",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "669--678",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/stanich.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mastie:1997:UTE,
author = "S. D. Mastie",
title = "Use of the transform exit sequence in printing and as
a framework for the solution of complex problems",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "679--692",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/mastie.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bassok:1997:DCS,
author = "Y. Bassok and A. Bixby and R. Srinivasan and H. Z.
Wiesel",
title = "Design of component-supply contract with
commitment-revision flexibility",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "693--703",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:05 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/bassok.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Glaise:1997:TSC,
author = "R. J. Glaise",
title = "A two-step computation of cyclic redundancy code
{CRC-32} for {ATM} networks",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "705--709",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:05 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/glaise.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Toledo:1997:IMS,
author = "S. Toledo",
title = "Improving the memory-system performance of
sparse-matrix vector multiplication",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "711--725",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/toledo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Alfonseca:1997:SRF,
author = "M. Alfonseca and A. Ortega",
title = "A study of the representation of fractal curves by
{$L$} systems and their equivalences",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "727--736",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/alfonseca.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gustavson:1997:RLA,
author = "F. G. Gustavson",
title = "Recursion leads to automatic variable blocking for
dense linear-algebra algorithms",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "737--755",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/gustavson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "757--??",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:31:52 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:Pd,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "769--??",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:31:52 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:AIV,
author = "Anonymous",
title = "Author index for {Volume 41}",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "775--??",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:31:52 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/authv41.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1997:SIV,
author = "Anonymous",
title = "Subject index for Volume 41",
journal = j-IBM-JRD,
volume = "41",
number = "6",
pages = "779--??",
month = nov,
year = "1997",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Mar 25 09:31:52 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/416/subjv41.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Parkin:1998:MMM,
author = "S. S. P. Parkin",
title = "The magic of magnetic multilayers: Introduction to
this group of papers",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "3--6",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/parkin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Allenspach:1998:OMP,
author = "R. Allenspach and W. Weber",
title = "Oscillatory magnetic properties",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "7--24",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/allenspach.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jones:1998:TEC,
author = "B. A. Jones",
title = "Theory of exchange coupling in magnetic multilayers",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "25--31",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/jones.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Himpsel:1998:ESM,
author = "F. J. Himpsel and T. A. Jung and P. F. Seidler",
title = "Electronic states in magnetic nanostructures",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "33--42",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/himpsel.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Farrow:1998:RMB,
author = "R. F. C. Farrow",
title = "The role of molecular beam epitaxy in research on
giant magnetoresistance and interlayer exchange
coupling",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "43--52",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:09 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/farrow.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nesbet:1998:TSD,
author = "R. K. Nesbet",
title = "Theory of spin-dependent conductivity in {GMR}
materials",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "53--71",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:09 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/nesbet.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stohr:1998:MPT,
author = "J. Stohr and R. Nakajima",
title = "Magnetic properties of transition-metal multilayers
studied with {X}-ray magnetic circular dichroism
spectroscopy",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "73--89",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:09 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/stohr.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sun:1998:MDM,
author = "J. Z. Sun and L. Krusin-Elbaum and A. Gupta and Gang
Xiao and P. R. Duncombe and S. S. P. Parkin",
title = "Magnetotransport in doped manganate perovskites",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "89--102",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:10 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/sun.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tsang:1998:DFP,
author = "C. H. Tsang and R. E. {Fontana, Jr.} and T. Lin and D.
E. Heim and B. A. Gurney and M. L. Williams",
title = "Design, fabrication, and performance of spin-valve
read heads for magnetic recording applications",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "103--116",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:10 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/tsang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ziegler:1998:TCR,
author = "J. F. Ziegler",
title = "Terrestrial cosmic ray intensities",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "117--139",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:11 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/ziegler.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "141--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "42",
number = "1",
pages = "151--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/421/patents.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dan:1998:PMS,
author = "A. Dan and S. I. Feldman and D. N. Serpanos",
title = "Preface: Multimedia Systems",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "162--163",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd/422/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Flynn:1998:MI,
author = "R. J. Flynn and W. H. Tetzlaff",
title = "Multimedia --- An introduction",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "165--176",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:12 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/flynn.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dan:1998:ECM,
author = "A. Dan and S. I. Feldman and an D. N. Serpanos",
title = "Evolution and challenges in multimedia",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "177--184",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:12 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/dan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haskin:1998:TSS,
author = "R. L. Haskin",
title = "{Tiger Shark} --- a scalable file system for
multimedia",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "185--197",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/haskin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanuki:1998:DVS,
author = "T. Sanuki and Y. Asakawa",
title = "Design of a video-server complex for interactive
television",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "199--218",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/sanuki.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kumar:1998:VSD,
author = "M. Kumar",
title = "Video-server designs for supporting very large numbers
of concurrent users",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "219--232",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/kumar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bolle:1998:VQR,
author = "R. M. Bolle and B.-L. Yeo and M. M. Yeung",
title = "Video query: Research directions",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "233--252",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:14 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/bolle.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Castelli:1998:PSR,
author = "V. Castelli and L. D. Bergman and I. Kontoyiannis and
C.-S. Li and J. T. Robinson and J. J. Turek",
title = "Progressive search and retrieval in large image
archives",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "253--268",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:14 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/castelli.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Willebeek-LeMair:1998:BAV,
author = "M. H. Willebeek-LeMair and K. G. Kumar and E. C.
Snible",
title = "{Bamba} --- {Audio} and video streaming over the
{Internet}",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "269--280",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:15 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/willebeek.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bisdikian:1998:MDC,
author = "C. Bisdikian and S. Brady and Y. N. Doganata and D. A.
Foulger and F. Marconcini and M. Mourad and H. L.
Operowsky and G. Pacifici and A. N. Tantawi",
title = "{MultiMedia} Digital Conferencing: a {Web}-enabled
multimedia teleconferencing system",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "281--298",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:15 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/bisdikian.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "299--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "42",
number = "2",
pages = "305--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/422/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Alt:1998:IED,
author = "P. M. Alt and K. Noda",
title = "Increasing electronic display information content: An
introduction",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "315--320",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:15 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/alt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Melcher:1998:DFP,
author = "R. L. Melcher and P. M. Alt and D. B. Dove and T. M.
Cipolla and E. G. Colgan and F. E. Doany and K. Enami
and K. C. Ho and I. Lovas and C. Narayan and R. S.
{Olyha, Jr.} and C. G. Powell and A. E. Rosenbluth and
J. L. Sanford and E. S. Schlig and R. N. Singh and T.
Tomooka and M. Uda and K. H. Yang",
title = "Design and fabrication of a prototype projection data
monitor with high information content",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "321--338",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:16 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See addendum \cite{Melcher:1998:ADF}.",
URL = "http://www.almaden.ibm.com/journal/rd/423/melcher.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Colgan:1998:CML,
author = "E. G. Colgan and M. Uda",
title = "On-chip metallization layers for reflective light
valves",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "339--345",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:16 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/colgan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanford:1998:SLV,
author = "J. L. Sanford and E. S. Schlig and T. Tomooka and K.
Enami and F. R. Libsch",
title = "Silicon light-valve array chip for high-resolution
reflective liquid crystal projection displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "347--358",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:17 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See addendum \cite{Sanford:1998:ASL}.",
URL = "http://www.almaden.ibm.com/journal/rd/423/sanford.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rosenbluth:1998:CPR,
author = "A. E. Rosenbluth and D. B. Dove and F. E. Doany and R.
N. Singh and K. H. Yang and M. Lu",
title = "Contrast properties of reflective liquid crystal light
valves in projection displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "359--386",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:17 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/rosenbluth.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Doany:1998:PDT,
author = "F. E. Doany and R. N. Singh and A. E. Rosenbluth and
G. L.-T. Chiu",
title = "Projection display throughput: Efficiency of optical
transmission and light-source collection",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "387--399",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:17 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/doany.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yang:1998:NLM,
author = "K. H. Yang and M. Lu",
title = "Nematic {LC} modes and {LC} phase gratings for
reflective spatial light modulators",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "401--410",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:18 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/yang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanford:1998:OMR,
author = "J. L. Sanford and P. F. Greier and K. H. Yang and M.
Lu and R. S. {Olyha, Jr.} and C. Narayan and J. A.
Hoffnagle and P. M. Alt and R. L. Melcher",
title = "A one-megapixel reflective spatial light modulator
system for holographic storage",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "411--426",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:18 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/greier.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Colgan:1998:DSA,
author = "E. G. Colgan and P. M. Alt and R. L. Wisnieff and P.
M. Fryer and E. A. Galligan and W. S. Graham and P. F.
Greier and R. R. Horton and H. Ifill and L. C. Jenkins
and R. A. John and R. I. Kaufman and Y. Kuo and A. P.
Lanzetta and K. F. Latzko and F. R. Libsch and S.-C. A.
Lien and S. E. Millman and R. W. Nywening and R. J.
Polastre and C. G. Powell and R. A. Rand and J. J.
Ritsko and M. B. Rothwell and J. L. Staples and K. W.
Warren and J. S. Wilson and S. L. Wright",
title = "A 10.5-in.-diagonal {SXGA} active-matrix display",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "427--444",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:19 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/wisnieff.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wright:1998:ALR,
author = "S. L. Wright and K. W. Warren and P. M. Alt and R. R.
Horton and C. Narayan and P. F. Greier and M. Kodate",
title = "Active line repair for thin-film-transistor liquid
crystal displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "445--457",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:19 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/wright.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kusafuka:1998:DMG,
author = "K. Kusafuka and H. Shimizu and S. Kimura",
title = "Driving method for gate-delay compensation of
{TFT/LCD}",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "459--466",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:20 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/kusafuka.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Libsch:1998:UCH,
author = "F. R. Libsch and S.-C. A. Lien",
title = "Understanding crosstalk in high-resolution color
thin-film-transistor liquid crystal displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "467--479",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:20 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/libsch.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Colgan:1998:TFT,
author = "E. G. Colgan and R. J. Polastre and M. Takeichi and R.
L. Wisnieff",
title = "Thin-film-transistor process-characterization test
structures",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "481--490",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:21 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/polastre.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arai:1998:ABG,
author = "T. Arai and H. Iiyori and Y. Hiromasu and M. Atsumi
and S. Ioku and K. Furuta",
title = "Aluminum-based gate structure for active-matrix liquid
crystal displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "491--499",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:21 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/arai.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Takatsuji:1998:EAN,
author = "H. Takatsuji and E. G. Colgan and C. {Cabral, Jr.} and
J. M. E. Harper",
title = "Evaluation of {Al(Nd)}-alloy films for application to
thin-film-transistor liquid crystal displays",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "501--508",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:21 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/takatsuji.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tsuji:1998:ACS,
author = "S. Tsuji and K. Tsujimoto and H. Iwama",
title = "Application of cross-sectional transmission electron
microscopy to thin-film-transistor failure analysis",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "509--516",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:22 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/tsuji.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nishida:1998:MCU,
author = "H. Nishida and K. Sakamoto and Hideki Ogawa and Hiromi
Ogawa",
title = "Micropitch connection using anisotropic conductive
materials for driver {IC} attachment to a liquid
crystal display",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "517--525",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:22 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/nishida.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tanase:1998:NBS,
author = "H. Tanase and J. Mamiya and M. Suzuki",
title = "A new backlighting system using a polarizing light
pipe",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "527--536",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:23 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/tanase.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lien:1998:AMD,
author = "S.-C. A. Lien and P. Chaudhari and J. A. Lacey and R.
A. John and J. L. Speidell",
title = "Active-matrix display using ion-beam-processed
polyimide film for liquid crystal alignment",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "537--542",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:23 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/lien.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "543--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "42",
number = "3/4",
pages = "553--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/423/patents.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Datta:1998:AEM,
author = "M. Datta",
title = "Applications of electrochemical microfabrication: An
introduction",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "563--566",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:24 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/intro.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andricacos:1998:DCE,
author = "C. Andricacos and C. Uzoh and J. O. Dukovic and J.
Horkans and H. Deligianni",
title = "{Damascene} copper electroplating for chip
interconnections",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "567--574",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:24 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/andricacos.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Krongelb:1998:EPA,
author = "S. Krongelb and L. T. Romankiw and J. A. Tornello",
title = "Electrochemical process for advanced package
fabrication",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "575--585",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:24 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/krongelb.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wong:1998:MPH,
author = "K. K. H. Wong and S. Kaja and P. W. DeHaven",
title = "Metallization by plating for high-performance
multichip modules",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "587--596",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:25 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/wong.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Perfecto:1998:TFM,
author = "E. D. Perfecto and A. P. Giri and R. R. Shields and H.
P. Longworth and J. R. Pennacchia and M. P. Jeanneret",
title = "Thin-film multichip module packages for high-end {IBM}
servers",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "597--606",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:25 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/perfecto.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{OSullivan:1998:EDD,
author = "E. J. O'Sullivan and A. G. Schrott and M. Paunovic and
C. J. Sambucetti and J. R. Marino and P. J. Bailey and
S. Kaja and K. W. Semkow",
title = "Electrolessly deposited diffusion barriers for
microelectronics",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "607--620",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:26 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/osullivan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Horkans:1998:PMM,
author = "J. Horkans",
title = "Polarographic methods of monitoring addition agents in
the electroplating of {Sn-Pb} solders",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "621--628",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:26 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/horkans.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kohl:1998:PES,
author = "P. A. Kohl",
title = "Photoelectrochemical etching of semiconductors",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "629--637",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:26 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/kohl.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{vonGutfeld:1998:EML,
author = "R. J. {von Gutfeld} and K. G. Sheppard",
title = "Electrochemical microfabrication by laser-enhanced
photothermal processes",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "639--653",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:27 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/vongutfeld.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Datta:1998:MEM,
author = "M. Datta",
title = "Microfabrication by electrochemical metal removal",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "655--669",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:27 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/datta.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andricacos:1998:FDE,
author = "P. C. Andricacos and N. Robertson",
title = "Future directions in electroplated materials for
thin-film recording heads",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "671--680",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:28 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/robertson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{OSullivan:1998:IVR,
author = "E. J. O'Sullivan and E. I. Cooper and L. T. Romankiw
and K. T. Kwietniak and P. L. Trouilloud and J. Horkans
and C. V. Jahnes and I. V. Babich and S. Krongelb and
S. G. Hegde and J. A. Tornello and N. C. LaBianca and
J. M. Cotte and T. J. Chainer",
title = "Integrated, variable-reluctance magnetic minimotor",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "681--694",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:28 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/cooper.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "695--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/recentpub.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:Pd,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "42",
number = "5",
pages = "711--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 25 11:12:23 MST 1998",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/425/patents.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Burroughs:1998:DCT,
author = "S. H. Burroughs and T. R. Lattrell",
title = "Data compression technology in {ASIC} cores",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "725--731",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:29 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/burroughs.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Craft:1998:FHD,
author = "D. J. Craft",
title = "A fast hardware data compression algorithm and some
algorithmic extensions",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "733--745",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:29 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/craft.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Slattery:1998:DCA,
author = "M. J. Slattery and F. A. Kampf",
title = "Design considerations for the {ALDC} cores",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "747--752",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:29 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/slattery.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marks:1998:JAC,
author = "K. M. Marks",
title = "A {JBIG-ABIC} compression engine for digital document
processing",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "753--758",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:30 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/marks.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kampf:1998:PFC,
author = "F. A. Kampf",
title = "Performance as a function of compression",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "759--766",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:30 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/kampf.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Slattery:1998:QC,
author = "M. J. Slattery and J. L. Mitchell",
title = "The {Qx}-coder",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "767--784",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:30 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/mitchell.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Colyer:1998:IJA,
author = "P. S. Colyer and J. L. Mitchell",
title = "The {IBM JBIG-ABIC Verification Suite}",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "785--794",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:31 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/colyer.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1998:IMS,
author = "R. E. Anderson and E. M. Foster and D. E. Franklin and
R. S. Svec",
title = "Integrating the {MPEG-2} subsystem for digital
television",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "795--806",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:31 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/anderson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kemp:1998:DCP,
author = "T. M. Kemp and R. K. Montoye and J. D. Harper and J.
D. Palmer and D. J. Auerbach",
title = "A decompression core for {PowerPC}",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "807--812",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:32 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/kemp.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Matick:1998:MNM,
author = "R. E. Matick",
title = "Modular nets ({MNETS}): a modular design methodology
for computer timers",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "813--830",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:32 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/matick.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:RPIe,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "831--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:Pe,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "839--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:AIV,
author = "Anonymous",
title = "Author index for Volume 42",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "861--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/authv42.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1998:SIV,
author = "Anonymous",
title = "Subject index for Volume 42",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "867--??",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/426/subjv42.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Melcher:1998:ADF,
author = "R. L. Melcher and R. R. Horton and H. Ifill",
title = "Addendum: Design and Fabrication of a Prototype
Projection Data Monitor with High Information-Content
(Vol 42, Pg 321, 1998)",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "874--874",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
note = "See \cite{Melcher:1998:DFP}.",
URL = "http://www.almaden.ibm.com/journal/rd/426/addenda.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanford:1998:ASL,
author = "J. L. Sanford and H. S. P. Wong",
title = "Addendum: Silicon Light-Valve Array Chip for
High-Resolution Reflective Liquid-Crystal Projection
Displays (Vol 42, Pg 347, 1998)",
journal = j-IBM-JRD,
volume = "42",
number = "6",
pages = "874--874",
month = "????",
year = "1998",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
note = "See \cite{Sanford:1998:SLV}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
journalabr = "IBM J Res Develop",
}
@Article{Kuo:1999:PPP,
author = "Y. Kuo",
title = "Preface: Papers on Plasma Processing",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "3--4",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
Science Citation Index database (1980--date)",
URL = "http://www.almaden.ibm.com/journal/rd/431/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cote:1999:PAC,
author = "D. R. Cote and S. V. Nguyen and A. K. Stamper and D.
S. Armbrust and D. Tobben and R. A. Conti and G. Y.
Lee",
title = "Plasma-assisted chemical vapor deposition of
dielectric thin films for {ULSI} semiconductor
circuits",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "5--38",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:34 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/cote.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Armacost:1999:PEP,
author = "M. Armacost and P. D. Hoh and R. Wise and W. Yan and
J. J. Brown and J. H. Keller and G. A. Kaplita and S.
D. Halle and K. P. Muller and M. D. Naeem and S.
Srinivasan and H. Y. Ng and M. Gutsche and A. Gutmann
and B. Spuler",
title = "Plasma-etching processes for {ULSI} semiconductor
circuits",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "39--72",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:34 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/armacost.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kuo:1999:PPF,
author = "Y. Kuo and M. Okajima and M. Takeichi",
title = "Plasma processing in the fabrication of amorphous
silicon thin-film-transistor arrays",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "73--88",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:35 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/kuo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hsiao:1999:FMR,
author = "R. Hsiao",
title = "Fabrication of magnetic recording heads and dry
etching of head materials",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "89--102",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:35 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/hsiao.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fonash:1999:PPD,
author = "S. J. Fonash",
title = "Plasma processing damage in etching and deposition",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "103--107",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:36 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/fonash.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nguyen:1999:HDP,
author = "S. V. Nguyen",
title = "High-density plasma chemical vapor deposition of
silicon-based dielectric films for integrated
circuits",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "109--126",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:36 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/nguyen.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hess:1999:PAO,
author = "D. W. Hess",
title = "Plasma-assisted oxidation, anodization, and
nitridation of silicon",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "127--145",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:36 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/hess.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Grill:1999:PDD,
author = "A. Grill",
title = "Plasma-deposited diamondlike carbon and related
materials",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "147--161",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:37 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/grill.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rossnagel:1999:SDS,
author = "S. M. Rossnagel",
title = "Sputter deposition for semiconductor manufacturing",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "163--179",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:37 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/rossnagel.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Oehrlein:1999:SSI,
author = "G. S. Oehrlein and M. F. Doemling and B. E. E.
Kastenmeier and P. J. Matsuo and N. R. Rueger and M.
Schaepkens and T. E. F. M. Standaert",
title = "Surface science issues in plasma etching",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "181--197",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:38 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/oehrlein.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hamaguchi:1999:MSM,
author = "S. Hamaguchi",
title = "Modeling and simulation methods for plasma
processing",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "199--215",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:38 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/hamaguchi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "217--??",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "43",
number = "1/2",
pages = "227--??",
month = "????",
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 15 11:22:36 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.almaden.ibm.com/journal/rd/431/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buchanan:1999:PPU,
author = "D. A. Buchanan",
title = "Preface: Papers on Ultrathin Dielectric Films",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "243--244",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buchanan:1999:SGD,
author = "D. A. Buchanan",
title = "Scaling the gate dielectric: Materials, integration,
and reliability",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "245--264",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:39 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/buchanan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gusev:1999:GCU,
author = "E. P. Gusev and H.-C. Lu and E. L. Garfunkel and T.
Gustafsson and M. L. Green",
title = "Growth and characterization of ultrathin nitrided
silicon oxide films",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "265--286",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:39 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/gusev.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ellis:1999:NON,
author = "K. A. Ellis and R. A. Buhrman",
title = "Nitrous oxide ({N$_2$O}) processing for silicon
oxynitride gate dielectrics",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "287--300",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:40 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/ellis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lucovsky:1999:UNG,
author = "G. Lucovsky",
title = "Ultrathin nitrided gate dielectrics: Plasma
processing, chemical characterization, performance, and
reliability",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "301--326",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:40 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/lucovsky.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lo:1999:MCQ,
author = "S.-H. Lo and D. A. Buchanan and Y. Taur",
title = "Modeling and characterization of quantization,
polysilicon depletion, and direct tunneling effects in
{MOSFETs} with ultrathin oxides",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "327--337",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:41 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/lo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Heyns:1999:CEC,
author = "M. M. Heyns and T. Bearda and I. Cornelissen and S.
{De Gendt} and R. Degraeve and G. Groeseneken and
C. Kenens and D. M. Knotter and L. M. Loewenstein and
P. W. Mertens and S. Mertens and M. Meuris and T. Nigam
and M. Schaekers and I. Teerlinck and W. Vandervorst
and R. Vos and K. Wolke",
title = "Cost-effective cleaning and high-quality thin gate
oxides",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "339--350",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:41 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/heyns.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Okorn-Schmidt:1999:CSS,
author = "H. F. Okorn-Schmidt",
title = "Characterization of silicon surface preparation
processes for advanced gate dielectrics",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "351--366",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:42 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/okorn.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kotecki:1999:BST,
author = "D. E. Kotecki and J. D. Baniecki and H. Shen and R. B.
Laibowitz and K. L. Saenger and J. J. Lian and T. M.
Shaw and S. D. Athavale and C. {Cabral, Jr.} and P. R.
Duncombe and M. Gutsche and G. Kunkel and Y.-J. Park
and Y.-Y. Wang and R. Wise",
title = "{(Ba,Sr)TiO$_3$} dielectrics for future
stacked-capacitor {DRAM}",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "367--380",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:42 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/kotecki.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Campbell:1999:TDT,
author = "S. A. Campbell and H.-S. Kim and D. C. Gilmer and B.
He and T. Ma and W. L. Gladfelter",
title = "Titanium dioxide ({TiO$_2$})-based gate insulators",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "383--392",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:42 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/campbell.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hook:1999:NGO,
author = "T. B. Hook and J. S. Burnham and R. J. Bolam",
title = "Nitrided gate oxides for {3.3-V} logic application:
Reliability and device design considerations",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "393--406",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:43 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/hook.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abadeer:1999:KMU,
author = "W. W. Abadeer and A. Bagramian and D. W. Conkle and C.
W. Griffin and E. Langlois and B. F. Lloyd and R. P.
Mallette and J. E. Massucco and J. M. McKenna and S. W.
Mittl and P. H. Noel",
title = "Key measurements of ultrathin gate dielectric
reliability and in-line monitoring",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "407--416",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:43 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/abadeer.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "417--??",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 17 16:34:50 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:PP,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "43",
number = "3",
pages = "431--??",
month = may,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 17 16:34:50 MDT 1999",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd43-3.html",
URL = "http://www.research.ibm.com/journal/rd/433/patents.txt",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gonzales:1999:PMT,
author = "Cesar A. Gonzales",
title = "Preface: Multimedia Technologies in {IBM}",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "450--452",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gonzales:1999:RME,
author = "C. A. Gonzales and H. Yeo and C. J. Kuo",
title = "Requirements for motion-estimation search range in
{MPEG-2} coded video",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "453--470",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:44 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/gonzales.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Westerink:1999:TPM,
author = "P. H. Westerink and R. Rajagopalan and C. A.
Gonzales",
title = "Two-pass {MPEG-2} variable-bit-rate encoding",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "471--488",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:45 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/westerink.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mohsenian:1999:SPC,
author = "N. Mohsenian and R. Rajagopalan and C. A. Gonzales",
title = "Single-pass constant- and variable-bit-rate {MPEG-2}
video compression",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "489--509",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:45 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/mohsenian.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boroczky:1999:SMU,
author = "L. B{\"o}r{\"o}czky and A. Y. Ngai and E. F.
Westermann",
title = "Statistical multiplexing using {MPEG-2} video
encoders",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "511--520",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:45 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/boroczky.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:1999:DMT,
author = "R. E. Anderson and E. M. Foster",
title = "Design of an {MPEG-2} transport demultiplexor core",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "521--532",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:46 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/anderson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reed:1999:PVE,
author = "C. A. Reed and D. J. Thygesen",
title = "Pseudorandom verification and emulation of an {MPEG-2}
transport demultiplexor",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "533--544",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:46 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/reed.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lam:1999:MRH,
author = "W.-M. Lam and L. Lu",
title = "Memory reduction for {HDTV} decoders",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "545--553",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:47 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/lam.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Manohar:1999:FPO,
author = "N. R. Manohar and A. Mehra and M. H. Willebeek-LeMair
and M. Naghshineh",
title = "A framework for programmable overlay multimedia
networks",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "555--577",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 18:18:25 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/manohar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hilgendorf:1999:EBP,
author = "R. B. Hilgendorf and G. J. Heim and W. Rosenstiel",
title = "Evaluation of branch-prediction methods on traces from
commercial applications",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "579--593",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/hilgendorf.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "595--601",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "43",
number = "4",
pages = "603--617",
month = jul,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:48 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/434/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Carswell:1999:PPI,
author = "Kevin Carswell and Cyril Price",
title = "Preface: Papers on {IBM S/390 Server G5\slash G6}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "619--620",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:05 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Katopis:1999:MTD,
author = "G. A. Katopis and W. D. Becker and T. R. Mazzawy and
H. H. Smith and C. K. Vakirtzis and S. A. Kuppinger and
B. Singh and P. C. Lin and J. {Bartells, Jr.} and G. V.
Kihlmire and P. N. Venkatachalam and H. I. Stoller and
J. L. Frankel",
title = "{MCM} technology and design for the {S/390 G5}
systems",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "621--650",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/katopis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rizzolo:1999:SPM,
author = "R. F. Rizzolo and G. Hinkel and S. Michnowski and T.
J. McPherson and A. J. Sutcliffe",
title = "System performance management for the {S/390 Parallel
Enterprise Server G5}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "651--660",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/rizzolo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Turgeon:1999:GGB,
author = "P. R. Turgeon and P. Mak and M. A. Blake and M. F. Fee
and C. B. {Ford III} and P. J. Meaney and R. Seigler
and W. W. Shen",
title = "The {S/390 G5\slash G6} binodal cache",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "661--670",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/turgeon.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Check:1999:CGG,
author = "M. A. Check and T. J. Slegel",
title = "Custom {S/390 G5} and {G6} microprocessors",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "671--680",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/check.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Averill:1999:CIM,
author = "R. M. {Averill III} and K. G. Barkley and M. A. Bowen
and P. J. Camporese and A. H. Dansky and R. F. Hatch
and D. E. Hoffman and M. D. Mayo and S. A. McCabe and
T. G. McNamara and T. J. McPherson and G. A. Northrop
and L. Sigal and H. H. Smith and D. A. Webber and P. M.
Williams",
title = "Chip integration methodology for the {IBM S/390 G5}
and {G6} custom microprocessors",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "681--706",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/averill.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schwarz:1999:GFP,
author = "E. M. Schwarz and C. A. Krygowski",
title = "The {S/390 G5} floating-point unit",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "707--721",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.435.0707",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/schwarz.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abbott:1999:ASS,
author = "P. H. Abbott and D. G. Brush and C. W. {Clark III} and
C. J. Crone and J. R. Ehrman and G. W. Ewart and C. A.
Goodrich and M. Hack and J. S. Kapernick and B. J.
Minchau and W. C. Shepard and R. M. {Smith, Sr.} and R.
Tallman and S. Walkowiak and A. Watanabe and W. R.
White",
title = "Architecture and software support in {IBM S/390
Parallel Enterprise Servers} for {IEEE} Floating-Point
arithmetic",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "723--760",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.435.0723",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 03 07:08:45 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Besides important history of the development of the
S/360 floating-point architecture, this paper has a
good description of IBM's algorithm for exact
decimal-to-binary conversion, complementing earlier
ones
\cite{Steele:1990:HPF,Clinger:1990:HRF,Knuth:1990:SPW,Burger:1996:PFP}.",
URL = "http://www.research.ibm.com/journal/rd/435/abbott.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Easter:1999:PES,
author = "R. J. Easter and E. W. Chencinski and E. J. D'Avignon
and S. R. Greenspan and W. A. Merz and C. D. Norberg",
title = "{S/390 Parallel Enterprise Server CMOS} Cryptographic
Coprocessor",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "761--776",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/easter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yeh:1999:CCC,
author = "P. C. Yeh and R. M. {Smith, Sr.}",
title = "{S/390 CMOS} Cryptographic Coprocessor Architecture:
Overview and design considerations",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "777--794",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Mar 06 15:45:29 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/yeh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gregg:1999:ICB,
author = "T. A. Gregg and K. M. Pandey and R. K. Errickson",
title = "The Integrated Cluster Bus for the {IBM S/390 Parallel
Sysplex}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "795--806",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/gregg.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{DeCusatis:1999:FOI,
author = "C. M. DeCusatis and D. J. {Stigliani, Jr.} and W. L.
Mostowy and M. E. Lewis and D. B. Petersen and N. R.
Dhondy",
title = "Fiber optic interconnects for the {IBM S/390 Parallel
Enterprise Server G5}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "807--828",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/decusatis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hoke:1999:STI,
author = "J. M. Hoke and P. W. Bond and T. Lo and F. S. Pidala
and G. Steinbrueck",
title = "Self-timed interface for {S/390 I/O} subsystem
interconnection",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "829--846",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/hoke.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jackson:1999:ISH,
author = "K. M. Jackson and K. N. Langston",
title = "{IBM S/390} storage hierarchy {G5} and {G6}
performance considerations",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "847--854",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/jackson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rao:1999:ICB,
author = "C. L. Rao and G. M. King and B. A. Weiler",
title = "{Integrated Cluster Bus} performance for the {IBM
S/390 Parallel Sysplex}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "855--862",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/rao.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Spainhower:1999:IPE,
author = "L. Spainhower and T. A. Gregg",
title = "{IBM S/390 Parallel Enterprise Server G5} fault
tolerance: a historical perspective",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "863--873",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/spainhower.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mueller:1999:RSI,
author = "M. Mueller and L. C. Alves and W. Fischer and M. L.
Fair and I. Modi",
title = "{RAS} strategy for {IBM S/390 G5} and {G6}",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "875--888",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/mueller.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buechner:1999:EMH,
author = "T. Buechner and R. Fritz and P. Guenther and M. Helms
and K. D. Lamb and M. Loew and T. Schlipf and M. H.
Walz",
title = "Event monitoring in highly complex hardware systems",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "889--898",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/buechner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Song:1999:GCM,
author = "P. Song and F. Motika and D. R. Knebel and R. F.
Rizzolo and M. P. Kusko",
title = "{S/390 G5 CMOS} microprocessor diagnostics",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "899--914",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/song.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{VanHuben:1999:PMV,
author = "G. A. {Van Huben} and T. G. McNamara and T. E.
Gilbert",
title = "{PLL} modeling and verification in a cycle-simulation
environment",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "915--925",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/vanhuben.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "927--930",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:AIV,
author = "Anonymous",
title = "Author index for Volume 43",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "931--935",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/authv43.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:1999:SIV,
author = "Anonymous",
title = "Subject index for Volume 43",
journal = j-IBM-JRD,
volume = "43",
number = "5/6",
pages = "937--942",
month = sep # "\slash " # nov,
year = "1999",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Apr 19 18:58:23 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/435/subjv43.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Isaac:2000:PEI,
author = "R. D. Isaac and J. A. Kash",
title = "Preface: Evolution of Information Technology
1957--1999",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "3--5",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:05 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lesser:2000:RAM,
author = "M. L. Lesser and J. W. Haanstra",
title = "The {Random-access Memory Accounting Machine}. {I}.
System organization of the {IBM 305}",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "6--15",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:49 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/lesser.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Noyes:2000:RAM,
author = "T. Noyes and W. E. Dickinson",
title = "The {Random-Access Memory Accounting Machine}. {II}.
The magnetic-disk, random-access memory",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "16--19",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:50 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/noyes.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Amdahl:2000:AIS,
author = "G. M. Amdahl and G. A. Blaauw and F. P. {Brooks,
Jr.}",
title = "Architecture of the {IBM System\slash 360}",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "21--36",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.441.0021",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:50 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/mathcw.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/amdahl.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
remark = "Reprint of \cite{Amdahl:1964:AIS}.",
}
@Article{Radin:2000:M,
author = "George Radin",
title = "The 801 minicomputer",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "37--46",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:50 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/radin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cocke:2000:MGR,
author = "John Cocke and V. Markstein",
title = "The evolution of {RISC} technology at {IBM}",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "48--55",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:51 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/cocke.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Davis:2000:SLT,
author = "E. M. Davis and W. E. Harding and R. S. Schwartz and
J. J. Corning",
title = "Solid Logic Technology: Versatile, high-performance
microelectronics",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "56--68",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:51 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/davis.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Critchlow:2000:DCC,
author = "D. L. Critchlow and R. H. Dennard and S. E. Schuster",
title = "Design and characteristics of $n$-channel
insulated-gate field-effect transistors",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "70--82",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:52 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/critchlow.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Keyes:2000:MEL,
author = "R. W. Keyes",
title = "Miniaturization of electronics and its limits",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "84--88",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:52 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/keyes.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ames:2000:REA,
author = "I. Ames and F. M. d'Heurle and R. E. Horstmann",
title = "Reduction of electromigration in aluminum films by
copper doping",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "89--91",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/ames.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Miller:2000:CCR,
author = "L. F. Miller",
title = "Controlled collapse reflow chip joining",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "93--104",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:53 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/miller.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koenig:2000:ARD,
author = "H. R. Koenig and L. I. Maissel",
title = "Application of rf discharges to sputtering",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "106--110",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/koenig.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stapper:2000:LYM,
author = "C. H. Stapper",
title = "{LSI} yield modeling and process monitoring",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "112--118",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/stapper.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ito:2000:CAR,
author = "H. Ito",
title = "Chemical amplification resists: History and
development within {IBM}",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "119--130",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:54 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/ito.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meyerson:2000:LTS,
author = "B. S. Meyerson",
title = "Low-temperature {Si} and {Si:Ge} epitaxy by ultrahigh
vacuum\slash chemical vapor deposition: Process
fundamentals",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "132--141",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/meyerson.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buturla:2000:FEA,
author = "E. M. Buturla and P. E. Cottrell and B. M. Grossman
and K. A. Salsburg",
title = "Finite-element analysis of semiconductor devices: The
{FIELDAY} program",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "142--156",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:55 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/buturla.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Darringer:2000:LSP,
author = "John A. Darringer and Daniel Brand and John V. Gerbi
and William H. {Joyner, Jr.} and Louise Trevillyan",
title = "{LSS}: a system for production logic synthesis",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "157--165",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/darringer.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dietrich:2000:NST,
author = "W. Dietrich and W. E. Proebster and P. Wolf",
title = "Nanosecond switching in thin magnetic films",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "167--174",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:56 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/dietrich.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hoagland:2000:HTD,
author = "A. S. Hoagland",
title = "A high track-density servo-access system for magnetic
recording disk storage",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "175--185",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/hoagland.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Speriosu:2000:MTF,
author = "V. S. Speriosu and D. A. {Herman, Jr.} and I. L.
Sanders and T. Yogi",
title = "Magnetic thin films in recording technology",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "186--204",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/speriosu.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Samuel:2000:SSM,
author = "A. L. Samuel",
title = "Some studies in machine learning using the game of
checkers",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "206--226",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:57 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/samuel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Clementi:2000:ICA,
author = "Enrico Clementi",
title = "Ab initio computations in atoms and molecules",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "228--245",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/clementi.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coppersmith:2000:C,
author = "D. Coppersmith",
title = "Cryptography",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "246--250",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:58 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/coppersmith.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Landauer:2000:SVC,
author = "R. Landauer",
title = "Spatial variation of currents and fields due to
localized scatterers in metallic conduction",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "251--259",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999. See comment
\cite{Landauer:1996:CSV}.",
URL = "http://www.research.ibm.com/journal/rd/441/landaueri.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Landauer:2000:IHG,
author = "R. Landauer",
title = "Irreversibility and heat generation in the computing
process",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "261--269",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/landauerii.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bennett:2000:NHR,
author = "Charles H. Bennett",
title = "Notes on the history of reversible computation",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "270--277",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:11:59 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/bennett.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Binnig:2000:STM,
author = "G. Binnig and H. Rohrer",
title = "Scanning tunneling microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "279--293",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/binnig.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sorokin:2000:CIL,
author = "P. P. Sorokin",
title = "Contributions of {IBM} to laser science --- 1960 to
the present",
journal = j-IBM-JRD,
volume = "44",
number = "1/2",
pages = "294--308",
month = jan # "\slash " # mar,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:00 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "Special issue: reprints on Evolution of information
technology 1957--1999.",
URL = "http://www.research.ibm.com/journal/rd/441/sorokin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Horn:2000:PDI,
author = "Paul M. Horn",
title = "Preface: Directions in Information Technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "310--310",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Thompson:2000:FMD,
author = "D. A. Thompson and J. S. Best",
title = "The future of magnetic data storage technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "311--322",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:01 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/thompson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Vettiger:2000:SMT,
author = "P. Vettiger and M. Despont and U. Drechsler and U.
D{\"u}rig and W. H{\"a}berle and M. I. Lutwyche and H.
E. Rothuizen and R. Stutz and R. Widmer and G. K.
Binnig",
title = "The ``Millipede'': More than thousand tips for future
{AFM} storage",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "323--340",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/vettiger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Ashley:2000:HDS,
author = "J. Ashley and M.-P Bernal and G. W. Burr and H. Coufal
and H. Guenther and J. A. Hoffnagle and C. M. Jefferson
and B. Marcus and R. M. Macfarlane and R. M. Shelby and
G. T. Sincerbox",
title = "Holographic data storage technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "341--368",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/ashley.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Isaac:2000:FCT,
author = "R. D. Isaac",
title = "The future of {CMOS} technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "369--378",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:02 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/isaac.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Theis:2000:FIT,
author = "T. N. Theis",
title = "The future of interconnection technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "379--390",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/theis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Meyerson:2000:SGB,
author = "B. S. Meyerson",
title = "Silicon:germanium-based mixed-signal technology for
optimization of wired and wireless telecommunications",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "391--407",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:03 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/meyerson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Wisnieff:2000:EDI,
author = "R. L. Wisnieff and J. J. Ritsko",
title = "Electronic displays for information technology",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "409--422",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:04 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/wisnieff.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Anonymous:2000:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "423--442",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Anonymous:2000:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "44",
number = "3",
pages = "443--452",
month = may,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-3.html",
URL = "http://www.research.ibm.com/journal/rd/443/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0221",
}
@Article{Tromp:2000:PPE,
author = "Rudolf M. Tromp",
title = "Preface: Papers on Emerging Analytical Techniques",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "454--455",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Jordan-Sweet:2000:SXR,
author = "J. L. Jordan-Sweet",
title = "Synchrotron {X-ray} scattering techniques for
microelectronics-related materials studies",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "457--476",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:05 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/jordansweet.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Batson:2000:ARA,
author = "P. E. Batson",
title = "Atomic resolution analytical microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "477--487",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/batson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Ross:2000:GPP,
author = "F. M. Ross",
title = "Growth processes and phase transformations studied by
in situ transmission electron microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "489--501",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:06 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/ross.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Tromp:2000:LEE,
author = "Rudolf M. Tromp",
title = "Low-energy electron microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "503--516",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/tromp.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Ludeke:2000:HEE,
author = "R. Ludeke",
title = "Hot-electron effects and oxide degradation in {MOS}
structures studied with ballistic electron emission
microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "517--534",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:07 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/ludeke.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Stohr:2000:XRS,
author = "J. St{\"o}hr and S. Anders",
title = "{X-ray} spectro-microscopy of complex materials and
surfaces",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "535--551",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/stohr.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Allenspach:2000:SPS,
author = "R. Allenspach",
title = "Spin-polarized scanning electron microscopy",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "553--570",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/allenspach.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Copel:2000:MEI,
author = "M. Copel",
title = "Medium-energy ion scattering for analysis of
microelectronic materials",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "571--582",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:09 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd44-4.html",
URL = "http://www.research.ibm.com/journal/rd/444/copel.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0222",
}
@Article{Tsang:2000:PIC,
author = "J. C. Tsang and J. A. Kash and D. P. Vallett",
title = "Picosecond imaging circuit analysis",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "583--604",
month = jul,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
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@Article{Elmroth:2000:ARS,
author = "E. Elmroth and F. G. Gustavson",
title = "Applying recursion to serial and parallel {QR}
factorization leads to better performance",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "605--624",
month = jul,
year = "2000",
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bibdate = "Mon Feb 12 08:12:09 2001",
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acknowledgement = ack-nhfb,
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}
@Article{Anonymous:2000:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "625--635",
month = jul,
year = "2000",
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bibdate = "Mon Feb 12 08:14:07 2001",
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@Article{Anonymous:2000:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "44",
number = "4",
pages = "637--660",
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year = "2000",
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@Article{Campbell:2000:F,
author = "George {Campbell, Jr.}",
title = "Foreword",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "i--ii",
month = sep,
year = "2000",
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ISSN = "0018-8646 (print), 2151-8556 (electronic)",
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bibdate = "Mon Feb 12 05:52:24 2001",
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ordernumber = "G322-0223",
xxnote = "Check pages??",
}
@Article{Donofrio:2000:MNM,
author = "Nicholas M. Donofrio",
title = "Message from {Nicholas M. Donofrio, Senior Vice
President, Manufacturing and Technology, IBM
Corporation}",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "iii--iii",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 22 15:55:55 MDT 2000",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0223",
xxnote = "Check pages??",
}
@Article{Garcia:2000:PRC,
author = "Armando Garcia",
title = "Preface: Research contributions by {NACME Scholars}",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "667--667",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:14:08 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/preface.html",
acknowledgement = ack-nhfb,
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fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0223",
}
@Article{Acoff:2000:CCL,
author = "V. L. Acoff and R. G. Thompson",
title = "Characterization of constitutional liquid film
migration in nickel-base alloy 718",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "668--680",
month = sep,
year = "2000",
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ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:11 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/acoff.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
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ordernumber = "G322-0223",
pdfsize = "985KB",
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@Article{Alexander:2000:PIP,
author = "W. E. Alexander and D. S. Reeves and C. S. {Gloster,
Jr.}",
title = "Parallel image processing with the block data parallel
architecture",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "681--702",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
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bibdate = "Mon Feb 12 08:12:11 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/alexander.pdf",
acknowledgement = ack-nhfb,
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fjournal = "IBM Journal of Research and Development",
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pdfsize = "1,804KB",
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@Article{Carter:2000:APP,
author = "P. H. {Carter II} and D. J. Pines and L. v. Rudd",
title = "Approximate performance of periodic hypersonic cruise
trajectories for global reach",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "703--714",
month = sep,
year = "2000",
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ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:12 2001",
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URL = "http://www.research.ibm.com/journal/rd/445/carter.pdf",
acknowledgement = ack-nhfb,
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ordernumber = "G322-0223",
pdfsize = "645KB",
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@Article{Drayton:2000:MPC,
author = "R. F. Drayton and R. M. Henderson and L. P. B.
Katehi",
title = "Monolithic packaging concepts for high isolation in
circuits and antennas",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "715--723",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:12 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/drayton.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
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journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0223",
pdfsize = "627KB",
}
@Article{Hernandez:2000:SNP,
author = "E. Hern{\'a}ndez and Y. Arkun",
title = "Stability of nonlinear polynomial {ARMA} models and
their inverse",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "725--747",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/hernandez.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0223",
pdfsize = "3,234KB",
}
@Article{Jones:2000:FRS,
author = "C. T. Jones and R. Celi",
title = "Frequency response sensitivity functions for
helicopter frequency domain system identification",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "748--757",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/jones.pdf",
acknowledgement = ack-nhfb,
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journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
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@Article{Bell:2000:FLM,
author = "P. McCauley Bell and L. Crumpton",
title = "A fuzzy linguistic model for the prediction of carpal
tunnel syndrome risks in an occupational environment",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "759--769",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:13 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/mccauley.pdf",
acknowledgement = ack-nhfb,
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ordernumber = "G322-0223",
pdfsize = "2,234KB",
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@Article{Nyberg:2000:MER,
author = "G. B. Nyberg and R. R. Balcarcel and B. D. Follstad
and G. Stephanopoulos and D. I. C. Wang",
title = "Metabolic effects on recombinant interferon-$\gamma$
glycosylation in continuous culture of {Chinese}
hamster ovary cells",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "770--783",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:14 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/nyberg.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
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pdfsize = "1,046KB",
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@Article{Anonymous:2000:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "785--789",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:14 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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acknowledgement = ack-nhfb,
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fjournal = "IBM Journal of Research and Development",
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@Article{Anonymous:2000:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "44",
number = "5",
pages = "791--796",
month = sep,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Feb 12 08:12:15 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/445/patents.html",
acknowledgement = ack-nhfb,
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fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0223",
}
@Article{Allen:2000:CCD,
author = "D. H. Allen and S. H. Dhong and H. P. Hofstee and J.
Leenstra and K. J. Nowka and D. L. Stasiak and D. F.
Wendel",
title = "Custom circuit design as a driver of microprocessor
performance",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "799--822",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/446/allen.html",
acknowledgement = ack-nhfb,
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fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Gustavson:2000:MSH,
author = "F. G. Gustavson and I. Jonsson",
title = "Minimal-storage high-performance {Cholesky}
factorization via blocking and recursion",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "823--850",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
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URL = "http://www.research.ibm.com/journal/rd/446/gustavson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Kunkel:2000:PMC,
author = "S. R. Kunkel and R. J. Eickemeyer and M. H. Lipasti
and T. J. Mullins and B. O'Krafka and H. Rosenberg and
S. P. VanderWiel and P. L. Vitale and L. D. Whitley",
title = "A performance methodology for commercial servers",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "851--872",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/kunkel.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{OConnell:2000:PNG,
author = "F. P. O'Connell and S. W. White",
title = "{POWER3}: The next generation of {PowerPC}
processors",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "873--884",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/oconnell.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Borkenhagen:2000:MPP,
author = "J. M. Borkenhagen and R. J. Eickemeyer and R. N. Kalla
and S. R. Kunkel",
title = "A multithreaded {PowerPC} processor for commercial
servers",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "885--898",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/borkenhagen.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Webb:2000:MD,
author = "C. F. Webb",
title = "{S/390} microprocessor design",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "899--907",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/webb.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Schlig:2000:SRL,
author = "E. S. Schlig and J. L. Sanford",
title = "An {SXGA} reflective liquid crystal projection light
valve incorporating inversion by pixel bootstrapping",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "909--918",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/schlig.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Ismail:2000:BPH,
author = "I. A. Saroit Ismail",
title = "Bandwidth problems in high-speed networks",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "919--938",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/ismail.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Anonymous:2000:RPI,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "939--952",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Anonymous:2000:P,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "953--962",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Anonymous:2000:AIV,
author = "Anonymous",
title = "Author index for {Volume 44}",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "963--966",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/authv44.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Anonymous:2000:SIV,
author = "Anonymous",
title = "Subject index for {Volume 44}",
journal = j-IBM-JRD,
volume = "44",
number = "6",
pages = "967--972",
month = nov,
year = "2000",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 24 09:44:45 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/446/subjv44.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0224",
}
@Article{Shaw:2001:OEI,
author = "J. M. Shaw and P. F. Seidlers",
title = "Organic electronics: Introduction",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "3--10",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/shaw.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Dimitrakopoulos:2001:OTF,
author = "C. D. Dimitrakopoulos and D. J. Mascaro",
title = "Organic thin-film transistors: a review of recent
advances",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "11--28",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/dimitrakopoulos.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Mitzi:2001:OIE,
author = "D. B. Mitzi and K. Chondroudis and C. R. Kagan",
title = "Organic-inorganic electronics",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "29--46",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/mitzi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Murray:2001:CSN,
author = "C. B. Murray and Shouheng Sun and W. Gaschler and H.
Doyle and T. A. Betley and C. R. Kagan",
title = "Colloidal synthesis of nanocrystals and nanocrystal
superlattices",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "47--56",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/murray.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Angelopoulos:2001:CPM,
author = "M. Angelopoulos",
title = "Conducting polymers in microelectronics",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "57--76",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/angelopoulos.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Riess:2001:ITI,
author = "W. Riess and H. Riel and T. Beierlein and W.
Br{\"u}tting and P. M{\"u}ller and P. F. Seidler",
title = "Influence of trapped and interfacial charges in
organic multilayer light-emitting devices",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "77--88",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/riess.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Alvarado:2001:SEE,
author = "S. F. Alvarado and L. Rossi and P. M{\"u}ller and P.
F. Seidler and W. Riess",
title = "{STM}-excited electroluminescence and spectroscopy on
organic materials for display applications",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "89--100",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/alvarado.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Curioni:2001:CSO,
author = "A. Curioni and W. Andreoni",
title = "Computer simulations for organic light-emitting
diodes",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "101--114",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/curioni.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Howard:2001:MBU,
author = "W. E. Howard and O. F. Prache",
title = "Microdisplays based upon organic light-emitting
diodes",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "115--128",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/howard.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Anonymous:2001:RPIa,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "129--138",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Anonymous:2001:Pa,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "45",
number = "1",
pages = "139--184",
month = jan,
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Apr 7 16:28:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-1.html",
URL = "http://www.research.ibm.com/journal/rd/451/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0225",
}
@Article{Harper:2001:P,
author = "Richard E. Harper",
title = "Preface",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "187--190",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Hu:2001:AFP,
author = "E. C. Hu and P. A. Joubert and R. B. King and J. D.
LaVoie and J. M. Tracey",
title = "{Adaptive Fast Path Architecture}",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "191--206",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/hu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Brock:2001:EBC,
author = "B. C. Brock and G. D. Carpenter and E. Chiprout and M.
E. Dean and P. L. De Backer and E. N. Elnozahy and H.
Franke and M. E. Giampapa and D. Glasco and J. L.
Peterson and R. Rajamony and R. Ravindran and F. L.
Rawson and R. L. Rockhold and J. Rubio",
title = "Experience with building a commodity {Intel}-based
{ccNUMA} system",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "207--228",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/brock.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Nanda:2001:HTC,
author = "A. K. Nanda and A.-T. Nguyen and M. M. Michael and D.
J. Joseph",
title = "High-throughput coherence control and hardware
messaging in {Everest}",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "229--243",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/nanda.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Franaszek:2001:ADS,
author = "P. A. Franaszek and P. Heidelberger and D. E. Poff and
J. T. Robinson",
title = "Algorithms and data structures for compressed-memory
machines",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "245--258",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/franaszek.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Franaszek:2001:IOC,
author = "P. A. Franaszek and J. T. Robinson",
title = "On internal organization in compressed random-access
memories",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "259--270",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/robinson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Tremaine:2001:IME,
author = "R. B. Tremaine and P. A. Franaszek and J. T. Robinson
and C. O. Schulz and T. B. Smith and M. E. Wazlowski
and P. M. Bland",
title = "{IBM Memory Expansion Technology} ({MXT})",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "271--285",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/tremaine.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Abali:2001:MET,
author = "B. Abali and H. Franke and D. E. Poff and R. A.
{Saccone, Jr.} and C. O. Schulz and L. M. Herger and T.
B. Smith",
title = "{Memory Expansion Technology} ({MXT}): Software
support and performance",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "287--302",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Smith:2001:MET,
author = "T. B. Smith and B. Abali and D. E. Poff and R. B.
Tremaine",
title = "{Memory Expansion Technology} ({MXT}): Competitive
impact",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "303--309",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/smith.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Castelli:2001:PMS,
author = "V. Castelli and R. E. Harper and P. Heidelberger and
S. W. Hunter and K. S. Trivedi and K. Vaidyanathan and
W. P. Zeggert",
title = "Proactive management of software aging",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "311--332",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/castelli.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Anonymous:2001:RPIb,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "333--338",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/recentpub.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Anonymous:2001:Pb,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "45",
number = "2",
pages = "339--360",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jul 25 12:07:16 MDT 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-2.html",
URL = "http://www.research.ibm.com/journal/rd/452/patents.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0226",
}
@Article{Swope:2001:P,
author = "William C. Swope and James M. Coffin and Barry
Robsons",
title = "Preface",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "363--365",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/preface.html;
http://www.research.ibm.com/journal/rd/453/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Morokuma:2001:MSS,
author = "K. Morokuma and D. G. Musaev and T. Vreven and H.
Basch and M. Torrent and D. V. Khoroshun",
title = "Model studies of the structures, reactivities, and
reaction mechanisms of metalloenzymes",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "367--395",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/morokuma.html;
http://www.research.ibm.com/journal/rd/453/morokuma.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Andreoni:2001:DBM,
author = "W. Andreoni and A. Curioni and T. Mordasini",
title = "{DFT}-based molecular dynamics as a new tool for
computational biology: {First} applications and
perspective",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "397--407",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/andreoni.html;
http://www.research.ibm.com/journal/rd/453/andreoni.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Huang:2001:QCD,
author = "L. Huang and L. Massa and J. Karle",
title = "Quantum crystallography, a developing area of
computational chemistry extending to macromolecules",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "409--416",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/huang.html;
http://www.research.ibm.com/journal/rd/453/huang.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Ayton:2001:IMD,
author = "G. S. D. Ayton and S. Bardenhagen and P. McMurtry and
D. Sulsky and G. A. Voth",
title = "Interfacing molecular dynamics with continuum dynamics
in computer simulation: {Toward} an application to
biological membranes",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "417--426",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/ayton.html;
http://www.research.ibm.com/journal/rd/453/ayton.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Baker:2001:AMF,
author = "N. A. Baker and D. Sept and M. J. Holst and J. A.
McCammon",
title = "The adaptive multilevel finite element solution of the
{Poisson--Boltzmann} equation on massively parallel
computers",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "427--438",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/baker.html;
http://www.research.ibm.com/journal/rd/453/baker.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Davison:2001:BFE,
author = "D. B. Davison and J. F. Burke",
title = "Brute force estimation of the number of human genes
using {EST} clustering as a measure",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "439--447",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/davison.html;
http://www.research.ibm.com/journal/rd/453/davison.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Birney:2001:HMM,
author = "E. Birney",
title = "Hidden {Markov} models in biological sequence
analysis",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "449--454",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/birney.html;
http://www.research.ibm.com/journal/rd/453/birney.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Floratos:2001:DPB,
author = "A. Floratos and I. Rigoutsos and L. Parida and Y.
Gao",
title = "{DELPHI}: a pattern-based method for detecting
sequence similarity",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "455--473",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/floratos.html;
http://www.research.ibm.com/journal/rd/453/floratos.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Eastwood:2001:EPS,
author = "M. P. Eastwood and C. Hardin and Z. Luthey-Schulten
and P. G. Wolynes",
title = "Evaluating protein structure-prediction schemes using
energy landscape theory",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "475--497",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/eastwood.html;
http://www.research.ibm.com/journal/rd/453/eastwood.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Kumar:2001:PFE,
author = "S. Kumar and H. J. Wolfson and R. Nussinov",
title = "Protein flexibility and electrostatic interactions",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "499--512",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/kumar.html;
http://www.research.ibm.com/journal/rd/453/kumar.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Tsai:2001:HBB,
author = "C.-J. Tsai and B. Ma and Y. Y. Sham and S. Kumar and
H. J. Wolfson and R. Nussinov",
title = "A hierarchical, building-block-based computational
scheme for protein structure prediction",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "513--523",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/tsai.html;
http://www.research.ibm.com/journal/rd/453/tsai.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Fain:2001:DOC,
author = "B. Fain and Y. Xia and M. Levitt",
title = "Determination of optimal {Chebyshev}-expanded
hydrophobic discrimination function for globular
proteins",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "525--532",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/fain.html;
http://www.research.ibm.com/journal/rd/453/fain.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Platt:2001:QGU,
author = "D. E. Platt and L. Parida and Y. Gao and A. Floratos
and I. Rigoutsos",
title = "{QSAR} in grossly underdetermined systems:
{Opportunities} and issues",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "533--544",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/platt.html;
http://www.research.ibm.com/journal/rd/453/platt.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Agrafiotis:2001:MOC,
author = "D. K. Agrafiotis",
title = "Multiobjective optimization of combinatorial
libraries",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "545--566",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/agrafiotis.html;
http://www.research.ibm.com/journal/rd/453/agrafiotis.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Anonymous:2001:RPIe,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "567--573",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/recentpub.html;
http://www.research.ibm.com/journal/rd/453/recentpub.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Anonymous:2001:Pe,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "45",
number = "3/4",
pages = "575--600",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:12 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-34.html",
URL = "http://www.research.ibm.com/journal/rd/453/patents.html;
http://www.research.ibm.com/journal/rd/453/patents.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0227",
}
@Article{Hefferon:2001:P,
author = "George J. Hefferon",
title = "Preface",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "603--604",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/preface.html;
http://www.research.ibm.com/journal/rd/455/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Bates:2001:RTN,
author = "A. K. Bates and M. Rothschild and T. M. Bloomstein and
T. H. Fedynyshyn and R. R. Kunz and V. Liberman and M.
Switkes",
title = "Review of technology for 157-nm lithography",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "605--614",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/bates.html;
http://www.research.ibm.com/journal/rd/455/bates.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Dhaliwal:2001:PEP,
author = "R. S. Dhaliwal and W. A. Enichen and S. D. Golladay
and M. S. Gordon and R. A. Kendall and J. E. Lieberman
and H. C. Pfeiffer and D. J. Pinckney and C. F.
Robinson and J. D. Rockrohr and W. Stickel and E. V.
Tressler",
title = "{PREVAIL} --- Electron projection technology approach
for next-generation lithography",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "615--638",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/dhaliwal.html;
http://www.research.ibm.com/journal/rd/455/dhaliwal.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Medeiros:2001:RPE,
author = "D. R. Medeiros and A. Aviram and C. R. Guarnieri and
W.-S. Huang and R. Kwong and C. K. Magg and A. P.
Mahorowala and W. M. Moreau and K. E. Petrillo and M.
Angelopoulos",
title = "Recent progress in electron-beam resists for advanced
mask-making",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "639--650",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/medeiros.html;
http://www.research.ibm.com/journal/rd/455/medeiros.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Liebmann:2001:TDL,
author = "L. W. Liebmann and S. M. Mansfield and A. K. Wong and
M. A. Lavin and W. C. Leipold and T. G. Dunham",
title = "{TCAD} development for lithography resolution
enhancement",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "651--665",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/liebmann.html;
http://www.research.ibm.com/journal/rd/455/liebmann.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Hinsberg:2001:CPA,
author = "W. D. Hinsberg and F. A. Houle and M. I. Sanchez and
G. M. Wallraff",
title = "Chemical and physical aspects of the post-exposure
baking process used for positive-tone chemically
amplified resists",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "667--682",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/hinsberg.html;
http://www.research.ibm.com/journal/rd/455/hinsberg.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Ito:2001:DBC,
author = "H. Ito",
title = "Dissolution behavior of chemically amplified resist
polymers for 248-, 193-, and 157-nm lithography",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "683--695",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/ito.html;
http://www.research.ibm.com/journal/rd/455/ito.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Michel:2001:PML,
author = "B. Michel and A. Bernard and A. Bietsch and E.
Delamarche and M. Geissler and D. Juncker and H. Kind
and J.-P. Renault and H. Rothuizen and H. Schmid and P.
Schmidt-Winkel and R. Stutz and H. Wolf",
title = "Printing meets lithography: {Soft} approaches to
high-resolution patterning",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "697--719",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/michel.html;
http://www.research.ibm.com/journal/rd/455/michel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Anonymous:2001:RPIc,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "721--730",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/recentpub.html;
http://www.research.ibm.com/journal/rd/455/recentpub.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Anonymous:2001:Pc,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "45",
number = "5",
pages = "731--760",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-5.html",
URL = "http://www.research.ibm.com/journal/rd/455/patents.html;
http://www.research.ibm.com/journal/rd/455/patents.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0228",
}
@Article{Steele:2001:UBB,
author = "S. W. Steele",
title = "Uninterruptible battery backup for {IBM AS\slash 400}
systems",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "763--770",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
URL = "http://www.research.ibm.com/journal/rd/456/steele.html;
http://www.research.ibm.com/journal/rd/456/steele.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Notohardjono:2001:MSF,
author = "B. D. Notohardjono and J. S. Corbin and S. J. Mazzuca
and S. C. McIntosh and H. Welz",
title = "Modular server frame with robust earthquake
retention",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "771--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Kuczynski:2001:SMN,
author = "J. Kuczynski and A. K. Sinha",
title = "Strain measurement and numerical analysis of an epoxy
adhesive subjected to thermal loads",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "783--788",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
URL = "http://www.research.ibm.com/journal/rd/456/kuczynski.html;
http://www.research.ibm.com/journal/rd/456/kuczynski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Irvin:2001:ESC,
author = "D. R. Irvin",
title = "Embedding a secondary communication channel
transparently within a cyclic redundancy check
({CRC})",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "789--796",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
URL = "http://www.research.ibm.com/journal/rd/456/irvin.html;
http://www.research.ibm.com/journal/rd/456/irvin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Alfonseca:2001:DFD,
author = "M. Alfonseca and A. Ortega",
title = "Determination of fractal dimensions from equivalent
{$L$} systems",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "797--805",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
URL = "http://www.research.ibm.com/journal/rd/456/alfonseca.html;
http://www.research.ibm.com/journal/rd/456/alfonseca.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Zuliani:2001:LR,
author = "P. Zuliani",
title = "Logical reversibility",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "807--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Matick:2001:AAF,
author = "R. E. Matick and T. J. Heller and M. Ignatowski",
title = "Analytical analysis of finite cache penalty and cycles
per instruction of a multiprocessor memory hierarchy
using miss rates and queuing theory",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "819--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:RPId,
author = "Anonymous",
title = "Recent publications by {IBM} authors",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "843--849 (??)",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:Pd,
author = "Anonymous",
title = "Patents",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "849--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:AIV,
author = "Anonymous",
title = "Author index for {Volume 45}",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "857--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:SIV,
author = "Anonymous",
title = "Subject index for {Volume 45}",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "863--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:EEN,
author = "Anonymous",
title = "Erratum and {Editor}'s Note",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "870--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:PPP,
author = "Anonymous",
title = "Papers on power and packaging in {IBM} systems",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "??--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Anonymous:2001:RP,
author = "Anonymous",
title = "Regular papers",
journal = j-IBM-JRD,
volume = "45",
number = "6",
pages = "??--??",
month = "????",
year = "2001",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 14 18:58:13 MST 2001",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/rd45-6.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0229",
}
@Article{Lund:2002:P,
author = "Vijay T. Lund",
title = "Preface",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "3--4",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/preface.html;
http://www.research.ibm.com/journal/rd/461/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Tendler:2002:PSM,
author = "J. M. Tendler and J. S. Dodson and J. S. {Fields, Jr.}
and H. Le and B. Sinharoy",
title = "{POWER4} system microarchitecture",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "5--25",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/tendler.html;
http://www.research.ibm.com/journal/rd/461/tendler.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Warnock:2002:CPD,
author = "J. D. Warnock and J. M. Keaty and J. Petrovick and J.
G. Clabes and C. J. Kircher and B. L. Krauter and P. J.
Restle and B. A. Zoric and C. J. Anderson",
title = "The circuit and physical design of the {POWER4}
microprocessor",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "27--51",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/warnock.html;
http://www.research.ibm.com/journal/rd/461/warnock.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Ludden:2002:FVP,
author = "J. M. Ludden and W. Roesner and G. M. Heiling and J.
R. Reysa and J. R. Jackson and B.-L. Chu and M. L. Behm
and J. R. Baumgartner and R. D. Peterson and J.
Abdulhafiz and W. E. Bucy and J. H. Klaus and D. J.
Klema and T. N. Le and F. D. Lewis and P. E. Milling
and L. A. McConville and B. S. Nelson and V. Paruthi
and T. W. Pouarz and A. D. Romonosky and J. Stuecheli
and K. D. Thompson and D. W. Victor and B. Wile",
title = "Functional verification of the {POWER4} microprocessor
and {POWER4} multiprocessor systems",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "53--76",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/ludden.html;
http://www.research.ibm.com/journal/rd/461/ludden.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Bossen:2002:FTD,
author = "D. C. Bossen and A. Kitamorn and K. F. Reick and M. S.
Floyd",
title = "Fault-tolerant design of the {IBM pSeries 690} system
using {POWER4} processor technology",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "77--86",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/bossen.html;
http://www.research.ibm.com/journal/rd/461/bossen.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Rodgers:2002:IRL,
author = "G. P. Rodgers and I. G. Bendrihem and T. J. Bucelot
and B. D. Burchett and J. C. Collins",
title = "Infrastructure requirements for a large-scale,
multi-site {VLSI} development project",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "87--95",
month = jan,
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/rodgers.html;
http://www.research.ibm.com/journal/rd/461/rodgers.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Agarwal:2002:FPN,
author = "R. C. Agarwal and R. F. Enenkel and F. G. Gustavson
and A. Kothari and M. Zubair",
title = "Fast pseudorandom-number generators with modulus $2^k$
or $2^{k-1}$ using fused multiply--add",
journal = j-IBM-JRD,
volume = "46",
number = "1",
pages = "97--116",
month = jan,
year = "2002",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.461.0097",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Mar 18 17:27:08 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/461/agarwal.html;
http://www.research.ibm.com/journal/rd/461/agarwal.pdf",
abstract = "Many numerically intensive computations done in a
scientific computing environment require uniformly
distributed pseudorandom numbers in the range $(0, 1)$
and $(-1, 1)$. For multiplicative congruential
generators with modulus $2^k$, $k \leq 52$, and period
$2^k-2$, we show that the cost per random number for
these two distributions is 3 and 3.125 multiply-adds on
RS/6000 processors. Our code, on the IBM POWER2 Model
590, produces more than 40 million uniformly
distributed pseudorandom numbers per second for both
ranges $(0, 1)$ and $(-1, 1)$. Additionally, our code
sustains the 40 million per second rate for data out of
cache. The Numerical Aerodynamic Simulation (NAS)
parallel benchmarks use a linear congruential generator
with modulus 246. Our result is about 50 times faster
than the generic implementation given in the
benchmarks. The extra-accuracy fused multiply-add
instruction of RS/6000 machines combined with a few
algorithmic innovations gives rise to the 50-fold
increase. If IEEE 64-bit arithmetic is used with our
Fortran code on POWER and PowerPC architectures, the
results we obtain are bit-wise identical to the generic
algorithms. The paper gives several illustrations of a
general technique called the Algorithm and Architecture
approach. We demonstrate herein that
programmer-controlled unrolling of loops is equivalent
to ``customized vectorization of RISC-type code.''
Customized vectorization is more powerful than ordinary
vectorization, and it is only possible on RISC-type
machines. We illustrate its use to show that RS/6000
processors can compute the distribution $(-1, 1)$ at
the rate of 3.125 multiply-adds. We also specify a
linear congruential generator that is related to the
multiplicative congruential generator referred to
above. It has a full period of 2k, where 2k is the
modulus. The cost per random number [in the range $(0,
1)$] for this generator is four multiply-adds on
RS/6000 processors. Our code, on the IBM POWER2 Model
590, for this generator produces more than 30 million
uniformly distributed pseudorandom numbers per second
for the range $(0, 1)$. We show that this generator is
``embarrassingly parallel,'' or EP. Using the Algorithm
and Architecture approach, we describe a new concept
called ``generalized unrolling.'' Finally, we present a
multiplicative congruential generator for which the
modulus is not a power of $2$. Such a generator, as
well as one with modulus $2^k$, is selectable as the
generator used in the RANDOM\_NUMBER intrinsic function
of IBM XL Fortran and XL High Performance Fortran. All
of the generators reported here are EP. Using an IBM
SP2 machine with 250 wide nodes, it is possible to
compute more than ten billion uniform random numbers in
a second.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0230",
}
@Article{Solomon:2002:P,
author = "Paul M. Solomon",
title = "Preface",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "119--120",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Shahidi:2002:STG,
author = "G. G. Shahidi",
title = "{SOI} technology for the {GHz} era",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "121--132",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/shahidi.html;
http://www.research.ibm.com/journal/rd/462/shahidi.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Wong:2002:BCT,
author = "H.-S. P. Wong",
title = "Beyond the conventional transistor",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "133--168",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/wong.html;
http://www.research.ibm.com/journal/rd/462/wong.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Nowak:2002:MBC,
author = "E. J. Nowak",
title = "Maintaining the benefits of {CMOS} scaling when
scaling bogs down",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "169--180",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/nowak.html;
http://www.research.ibm.com/journal/rd/462/nowak.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Ning:2002:WBS,
author = "T. H. Ning",
title = "Why {BiCMOS} and {SOI BiCMOS}?",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "181--186",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/ning.html;
http://www.research.ibm.com/journal/rd/462/ning.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Mandelman:2002:CFD,
author = "J. A. Mandelman and R. H. Dennard and G. B. Bronner
and J. K. DeBrosse and R. Divakaruni and Y. Li and C.
J. Radens",
title = "Challenges and future directions for the scaling of
dynamic random-access memory ({DRAM})",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "187--212",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/mandelman.html;
http://www.research.ibm.com/journal/rd/462/mandelman.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Taur:2002:CDN,
author = "Y. Taur",
title = "{CMOS} design near the limit of scaling",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "213--222",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/taur.html;
http://www.research.ibm.com/journal/rd/462/taur.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Nair:2002:EIC,
author = "R. Nair",
title = "Effect of increasing chip density on the evolution of
computer architectures",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "223--234",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/nair.html;
http://www.research.ibm.com/journal/rd/462/nair.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Frank:2002:PCC,
author = "D. J. Frank",
title = "Power-constrained {CMOS} scaling limits",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "235--244",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/frank.html;
http://www.research.ibm.com/journal/rd/462/frank.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Meindl:2002:IOG,
author = "J. D. Meindl and J. A. Davis and P. Zarkesh-Ha and C.
S. Patel and K. P. Martin and P. A. Kohl",
title = "Interconnect opportunities for gigascale integration",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "245--263",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/meindl.html;
http://www.research.ibm.com/journal/rd/462/meindl.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Stathis:2002:RLG,
author = "J. H. Stathis",
title = "Reliability limits for the gate insulator in {CMOS}
technology",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "265--286",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/stathis.html;
http://www.research.ibm.com/journal/rd/462/stathis.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Wu:2002:CSB,
author = "E. Y. Wu and E. J. Nowak and A. Vayshenker and W. L.
Lai and D. L. Harmon",
title = "{CMOS} scaling beyond the 100-nm node with
silicon-dioxide-based gate dielectrics",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "287--298",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/wu.html;
http://www.research.ibm.com/journal/rd/462/wu.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Osburn:2002:VSM,
author = "C. M. Osburn and I. Kim and S. K. Han and I. De and K.
F. Yee and S. Gannavaram and S. J. Lee and C.-H. Lee
and Z. J. Luo and W. Zhu and J. R. Hauser and D.-L.
Kwong and G. Lucovsky and T. P. Ma and M. C.
{\"O}zt{\"u}rk",
title = "Vertically scaled {MOSFET} gate stacks and junctions:
How far are we likely to go?",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "299--315",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/osburn.html;
http://www.research.ibm.com/journal/rd/462/osburn.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Agnello:2002:PRC,
author = "P. D. Agnello",
title = "Process requirements for continued scaling of
{CMOS}---the need and prospects for atomic-level
manipulation",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "317--338",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/agnello.html;
http://www.research.ibm.com/journal/rd/462/agnello.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Law:2002:PMF,
author = "M. E. Law",
title = "Process modeling for future technologies",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "339--346",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/law.html;
http://www.research.ibm.com/journal/rd/462/law.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Lochtefeld:2002:NIC,
author = "A. Lochtefeld and I. J. Djomehri and G. Samudra and D.
A. Antoniadis",
title = "New insights into carrier transport in {n-MOSFETs}",
journal = j-IBM-JRD,
volume = "46",
number = "2/3",
pages = "347--357",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/462/lochtefeld.html;
http://www.research.ibm.com/journal/rd/462/lochtefeld.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0231",
}
@Article{Turgeon:2002:P,
author = "Paul R. Turgeon",
title = "Preface",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "365--366",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/preface.html;
http://www.research.ibm.com/journal/rd/464/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Plambeck:2002:DAZ,
author = "K. E. Plambeck and W. Eckert and R. R. Rogers and C.
F. Webb",
title = "Development and attributes of {z/Architecture}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "367--379",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/plambeck.html;
http://www.research.ibm.com/journal/rd/464/plambeck.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Schwarz:2002:MIE,
author = "E. M. Schwarz and M. A. Check and C.-L. K. Shum and T.
Koehler and S. B. Swaney and J. D. MacDougall and C. A.
Krygowski",
title = "The microarchitecture of the {IBM eServer z900}
processor",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "381--395",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/schwarz.html;
http://www.research.ibm.com/journal/rd/464/schwarz.pdf",
abstract = "The recent IBM ESA/390 CMOS line of processors, from
1997 to 1999, consisted of the G4, G5, and G6
processors. The architecture they implemented lacked
64-bit addressability and had only a limited set of
64-bit arithmetic instructions. The processors also
lacked data and instruction bandwidth, since they
utilized a unified cache. The branch performance was
good, but there were delays due to conflicts in
searching and writing the branch target buffer. Also,
the hardware data compression and decimal arithmetic
performance, though good, was in demand by database and
COBOL programmers. Most of the performance concerns
regarding prior processors were due to area
constraints. Recent technology advances have increased
the circuit density by 50 percent over that of the G6
processor. This has allowed the design of several
performance-critical areas to be revisited. The end
result of these efforts is the IBM eServer z900
processor, which is the first high-end processor based
on the new 64-bit z/Architecture{\TM}.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Harrer:2002:FSL,
author = "H. Harrer and H. Pross and T.-M. Winkel and W. D.
Becker and H. I. Stoller and M. Yamamoto and S. Abe and
B. J. Chamberlin and G. A. Katopis",
title = "First- and second-level packaging for the {IBM eServer
z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "397--420",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/harrer.html;
http://www.research.ibm.com/journal/rd/464/harrer.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Stigliani:2002:IEZ,
author = "D. J. {Stigliani, Jr.} and T. E. Bubb and D. F. Casper
and J. H. Chin and S. G. Glassen and J. M. Hoke and V.
A. Minassian and J. H. Quick and C. H. Whitehead",
title = "{IBM eServer z900} {I/O} subsystem",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "421--445",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/stigliani.html;
http://www.research.ibm.com/journal/rd/464/stigliani.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Hoke:2002:STI,
author = "J. M. Hoke and P. W. Bond and R. R. Livolsi and T. C.
Lo and F. S. Pidala and G. Steinbrueck",
title = "Self-timed interface of the input\slash output
subsystem of the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "447--460",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/hoke.html;
http://www.research.ibm.com/journal/rd/464/hoke.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Gregg:2002:CCI,
author = "T. A. Gregg and R. K. Errickson",
title = "Coupling {I/O} channels for the {IBM eServer z900}:
Reengineering required",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "461--474",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/gregg.html;
http://www.research.ibm.com/journal/rd/464/gregg.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Baskey:2002:ZFO,
author = "M. E. Baskey and M. Eder and D. A. Elko and B. H.
Ratcliff and D. W. Schmidt",
title = "{zSeries} features for optimized sockets-based
messaging: {HiperSockets} and {OSA-Express}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "475--485",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/baskey.html;
http://www.research.ibm.com/journal/rd/464/baskey.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Adlung:2002:FIE,
author = "I. Adlung and G. Banzhaf and W. Eckert and G. Kuch and
S. Mueller and C. Raisch",
title = "{FCP} for the {IBM eServer zSeries} systems: Access to
distributed storage",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "487--502",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/adlung.html;
http://www.research.ibm.com/journal/rd/464/adlung.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Alves:2002:RDI,
author = "L. C. Alves and M. L. Fair and P. J. Meaney and C. L.
Chen and W. J. Clarke and G. C. Wellwood and N. E.
Weber and I. N. Modi and B. K. Tolan and F. Freier",
title = "{RAS} design for the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "503--521",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/alves.html;
http://www.research.ibm.com/journal/rd/464/alves.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Baitinger:2002:SCS,
author = "F. Baitinger and H. Elfering and G. Kreissig and D.
Metz and J. Saalmueller and F. Scholz",
title = "System control structure of the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "523--535",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/baitinger.html;
http://www.research.ibm.com/journal/rd/464/baitinger.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Bieswanger:2002:HCF,
author = "A. Bieswanger and F. Hardt and A. Kreissig and H.
Osterndorf and G. Stark and H. Weber",
title = "Hardware configuration framework for the {IBM eServer
z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "537--550",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/bieswanger.html;
http://www.research.ibm.com/journal/rd/464/bieswanger.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Probst:2002:FCC,
author = "J. Probst and B. D. Valentine and C. Axnix and K.
Kuehl",
title = "Flexible configuration and concurrent upgrade for the
{IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "551--558",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/probst.html;
http://www.research.ibm.com/journal/rd/464/probst.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Valentine:2002:ASE,
author = "B. D. Valentine and H. Weber and J. D. Eggleston",
title = "The alternate support element, a high-availability
service console for the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "559--566",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/valentine.html;
http://www.research.ibm.com/journal/rd/464/valentine.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Rooney:2002:IRD,
author = "W. J. Rooney and J. P. Kubala and J. Maergner and P.
B. Yocom",
title = "{Intelligent Resource Director}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "567--586",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/rooney.html;
http://www.research.ibm.com/journal/rd/464/rooney.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Koerner:2002:IEZ,
author = "S. Koerner and M. Kuenzel and E. C. McCain",
title = "{IBM eServer z900} system microcode verification by
simulation: The virtual power-on process",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "587--596",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/koerner.html;
http://www.research.ibm.com/journal/rd/464/koerner.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Kayser:2002:HAH,
author = "J. Kayser and S. Koerner and K.-D. Schubert",
title = "Hyper-acceleration and {HW\slash SW} co-verification
as an essential part of {IBM eServer z900}
verification",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "597--605",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/kayser.html;
http://www.research.ibm.com/journal/rd/464/kayser.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Buttlar:2002:ZCE,
author = "J. von Buttlar and H. B{\"o}hm and R. Ernst and A.
Horsch and A. Kohler and H. Schein and M. Stetter and
K. Theurich",
title = "{z/CECSIM}: An efficient and comprehensive microcode
simulator for the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "607--615",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/vonbuttlar.html;
http://www.research.ibm.com/journal/rd/464/vonbuttlar.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Silverio:2002:HID,
author = "J. F. Silverio and Y. M. Ng and D. F. Anderson",
title = "Hierarchical indexing data structure method for
verifying the functionality of the {STI-to-PCI} bridge
chips of the {IBM eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "617--629",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/silverio.html;
http://www.research.ibm.com/journal/rd/464/silverio.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Curran:2002:IEZ,
author = "B. W. Curran and Y. H. Chan and P. T. Wu and P. J.
Camporese and G. A. Northrop and R. F. Hatch and L. B.
Lacey and J. P. Eckhardt and D. T. Hui and H. H.
Smith",
title = "{IBM eServer z900} high-frequency microprocessor
technology, circuits, and design methodology",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "631--644",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/curran.html;
http://www.research.ibm.com/journal/rd/464/curran.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Desens:2002:MVP,
author = "Michael Desens",
title = "Message from the {Vice President, Server Systems
Development, IBM Server Group}",
journal = j-IBM-JRD,
volume = "46",
number = "4/5",
pages = "??--??",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:43 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/464/message.html;
http://www.research.ibm.com/journal/rd/464/message.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0232",
}
@Article{Reeves:2002:P,
author = "Thomas M. Reeves and Timothy K. Raveys",
title = "Preface",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "647--647",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Doerre:2002:IAS,
author = "G. W. Doerre and D. E. Lackey",
title = "The {IBM ASIC\slash SoC} methodology---{A} recipe for
first-time success",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "649--660",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/doerre.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Bednar:2002:ISP,
author = "T. R. Bednar and P. H. Buffet and R. J. Darden and S.
W. Gould and P. S. Zuchowski",
title = "Issues and strategies for the physical design of
system-on-a-chip {ASICs}",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "661--674",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/bednar.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Barth:2002:EDD,
author = "J. E. {Barth, Jr.} and J. H. Dreibelbis and E. A.
Nelson and D. L. Anand and G. Pomichter and P. Jakobsen
and M. R. Nelms and J. Leach and G. M. Belansek",
title = "Embedded {DRAM} design and architecture for the {IBM}
$0.11\mu$m {ASIC} offering",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "675--689",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/barth.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Darringer:2002:EAT,
author = "J. A. Darringer and R. A. Bergamaschi and S.
Bhattacharya and D. Brand and A. Herkersdorf and J. K.
Morrell and I. I. Nair and P. Sagmeister and Y. Shin",
title = "Early analysis tools for system-on-a-chip design",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "691--707",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/darringer.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Cozzolino:2002:P,
author = "Vincent Cozzolino and Prabjit Singhs",
title = "Preface",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "709--709",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/preface2.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Singh:2002:PPC,
author = "P. Singh and S. J. Ahladas and W. D. Becker and F. E.
Bosco and J. P. Corrado and G. F. Goth and S. Iruvanti
and M. A. Nobile and B. D. Notohardjono and J. H. Quick
and E. J. Seminaro and K. M. Soohoo and C. Wu",
title = "A power, packaging, and cooling overview of the {IBM
eServer z900}",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "711--738",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/singh.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Schmidt:2002:HES,
author = "R. R. Schmidt and B. D. Notohardjono",
title = "High-end server low-temperature cooling",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "739--751",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/schmidt.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Ellsworth:2002:DAS,
author = "M. J. {Ellsworth, Jr.} and R. R. Schmidt and D.
Agonafer",
title = "Design and analysis of a scheme to mitigate
condensation on an assembly used to cool a processor
module",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "753--761",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/ellsworth.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Corbin:2002:LGA,
author = "J. S. Corbin and C. N. Ramirez and D. E. Massey",
title = "Land grid array sockets for server applications",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "763--778",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/corbin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Knickerbocker:2002:AMM,
author = "J. U. Knickerbocker and F. L. Pompeo and A. F. Tai and
D. L. Thomas and R. D. Weekly and M. G. Nealon and H.
C. Hamel and A. Haridass and J. N. Humenik and R. A.
Shelleman and S. N. Reddy and K. M. Prettyman and B. V.
Fasano and S. K. Ray and T. E. Lombardi and K. C.
Marston and P. A. Coico and P. J. Brofman and L. S.
Goldmann and D. L. Edwards and J. A. Zitz and S.
Iruvanti and S. L. Shinde and H. P. Longworth",
title = "An advanced multichip module ({MCM}) for
high-performance {UNIX} servers",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "779--804",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/knickerbocker.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Anonymous:2002:AIV,
author = "Anonymous",
title = "Author index for Volume 46",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "805--810",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/authv46.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Anonymous:2002:SIV,
author = "Anonymous",
title = "Subject index for Volume 46",
journal = j-IBM-JRD,
volume = "46",
number = "6",
pages = "811--816",
month = "????",
year = "2002",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Nov 22 17:58:44 MST 2002",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/466/subjv46.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0233",
}
@Article{Dietrich:2003:P,
author = "Brenda Dietrich and Michael Shubs",
title = "Preface",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "3--3",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Adler:2003:MH,
author = "R. L. Adler and B. P. Kitchens and M. Martens and C.
P. Tresser and C. W. Wu",
title = "The mathematics of halftoning",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "5--15",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/adler.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Apte:2003:DIA,
author = "C. V. Apte and S. J. Hong and R. Natarajan and E. P.
D. Pednault and F. A. Tipu and S. M. Weiss",
title = "Data-intensive analytics for predictive modeling",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "17--23",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/apte.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Dietrich:2003:GAP,
author = "B. L. Dietrich and A. J. Hoffman",
title = "On greedy algorithms, partially ordered sets, and
submodular functions",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "25--30",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/dietrich.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Gustavson:2003:HPL,
author = "F. G. Gustavson",
title = "High-performance linear algebra algorithms using new
generalized data structures for matrices",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "31--55",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/gustavson.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Lougee-Heimer:2003:COI,
author = "R. Lougee-Heimer",
title = "The {Common Optimization INterface for Operations
Research}: Promoting open-source software in the
operations research community",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "57--66",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.coin-or.org/;
http://www.research.ibm.com/journal/rd/471/lougee.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Martens:2003:ETO,
author = "M. Martens and T. J. Nowicki",
title = "Ergodic theory of one-dimensional dynamics",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "67--76",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/martens.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Wisniewski:2003:EEC,
author = "M. Y. L. Wisniewski and E. Yashchin and R. L. Franch
and D. P. Conrady and G. Fiorenza and I. C. Noyan",
title = "Estimating the efficiency of collaborative
problem-solving, with applications to chip design",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "77--88",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/wisniewski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Pulleyblank:2003:MSN,
author = "W. R. Pulleyblank",
title = "Mathematical sciences in the nineties",
journal = j-IBM-JRD,
volume = "47",
number = "1",
pages = "89--96",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/471/pulleyblank.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0234",
}
@Article{Oprysko:2003:P,
author = "M. M. Oprysko",
title = "Preface: Mathematical Sciences at 40",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "99--100",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Dunn:2003:FRC,
author = "J. S. Dunn and D. C. Ahlgren and D. D. Coolbaugh and
N. B. Feilchenfeld and G. Freeman and D. R. Greenberg
and R. A. Groves and F. J. Guar{\'\i}n and Y. Hammad
and A. J. Joseph and L. D. Lanzerotti and S. A. St.Onge
and B. A. Orner and J.-S. Rieh and K. J. Stein and S.
H. Voldman and P.-C. Wang and M. J. Zierak and S.
Subbanna and D. L. Harame and D. A. {Herman, Jr.} and
B. S. Meyerson",
title = "Foundation of rf {CMOS} and {SiGe BiCMOS}
technologies",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "101--138",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/dunn.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Harame:2003:DAM,
author = "D. L. Harame and K. M. Newton and R. Singh and S. L.
Sweeney and S. E. Strang and J. B. Johnson and S. M.
Parker and C. E. Dickey and M. Erturk and G. J.
Schulberg and D. L. Jordan and D. C. Sheridan and M. P.
Keene and J. Boquet and R. A. Groves and M. Kumar and
D. A. {Herman, Jr.} and B. S. Meyerson",
title = "Design automation methodology and rf\slash analog
modeling for rf {CMOS} and {SiGe BiCMOS} technologies",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "139--175",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/harame.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Allen:2003:IPN,
author = "J. R. {Allen, Jr.} and B. M. Bass and C. Basso and R.
H. Boivie and J. L. Calvignac and G. T. Davis and L.
Frelechoux and M. Heddes and A. Herkersdorf and A. Kind
and J. F. Logan and M. Peyravian and M. A. Rinaldi and
R. K. Sabhikhi and M. S. Siegel and M. Waldvogel",
title = "{IBM PowerNP} network processor: Hardware, software,
and applications",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "177--193",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/allen.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Engbersen:2003:PST,
author = "A. P. J. Engbersen",
title = "{Prizma} switch technology",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "195--209",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/engbersen.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Clauberg:2003:DAA,
author = "R. Clauberg",
title = "Data aggregation architectures for single-chip
{SDH\slash SONET} framers",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "211--221",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/clauberg.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Pepeljugoski:2003:DOC,
author = "P. K. Pepeljugoski and D. M. Kuchta",
title = "Design of optical communications data links",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "223--237",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/pepeljugoski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Bona:2003:SHR,
author = "G.-L. Bona and R. Germann and B. J. Offrein",
title = "{SiON} high-refractive-index waveguide and planar
lightwave circuits",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "239--249",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/bona.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Trewhella:2003:EOS,
author = "J. M. Trewhella and G. W. Johnson and W. K. Hogan and
D. L. Karst",
title = "Evolution of optical subassemblies in {IBM} data
communication transceivers",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "251--258",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/trewhella.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Friedman:2003:SBI,
author = "D. J. Friedman and M. Meghelli and B. D. Parker and J.
Yang and H. A. Ainspan and A. V. Rylyakov and Y. H.
Kwark and M. B. Ritter and L. Shan and S. J. Zier and
M. Sorna and M. Soyuer",
title = "{SiGe BiCMOS} integrated circuits for high-speed
serial communication links",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "259--282",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/friedman.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Kosonocky:2003:LPC,
author = "S. V. Kosonocky and A. J. Bhavnagarwala and K. Chin
and G. D. Gristede and A.-M. Haen and W. Hwang and M.
B. Ketchen and S. Kim and D. R. Knebel and K. W. Warren
and V. Zyuban",
title = "Low-power circuits and technology for wireless digital
systems",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "283--298",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/kosonocky.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Moreno:2003:ILP,
author = "J. H. Moreno and V. Zyuban and U. Shvadron and F. D.
Neeser and J. H. Derby and M. S. Ware and K. Kailas and
A. Zaks and A. Geva and S. Ben-David and S. W. Asaad
and T. W. Fox and D. Littrell and M. Biberstein and D.
Naishlos and H. Hunter",
title = "An innovative low-power high-performance programmable
signal processor for digital communications",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "299--326",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/moreno.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Chevillat:2003:BRL,
author = "P. R. Chevillat and W. Schott",
title = "Broadband radio {LANs} and the evolution of wireless
beyond {$3$G}",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "327--336",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/chevillat.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Reynolds:2003:DCR,
author = "S. K. Reynolds and B. A. Floyd and T. J. Beukema and
T. Zwick and U. R. Pfeiffer and H. A. Ainspan",
title = "A direct-conversion receiver integrated circuit for
{WCDMA} mobile systems",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "337--353",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/reynolds.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Liu:2003:DIA,
author = "D. Liu and B. P. Gaucher and E. B. Flint and T. W.
Studwell and H. Usui and T. J. Beukema",
title = "Developing integrated antenna subsystems for laptop
computers",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "355--367",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/liu.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Meyerson:2003:MVP,
author = "Bernard S. Meyerson",
title = "Message from the {Vice President for Technology and
Chief Technologist, IBM Technology Group}",
journal = j-IBM-JRD,
volume = "47",
number = "2/3",
pages = "??--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Jun 28 14:47:05 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/472/message.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0235",
}
@Article{Bradshaw:2003:P,
author = "Richard Bradshaw",
title = "Preface",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "371--372",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Bradshaw:2003:FYI,
author = "R. Bradshaw and C. Schroeder",
title = "Fifty years of {IBM} innovation with information
storage on magnetic tape",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "373--383",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/bradshaw.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Biskeborn:2003:HDD,
author = "R. G. Biskeborn and J. H. Eaton",
title = "Hard-disk-drive technology flat heads for linear tape
recording",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "385--400",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/biskeborn.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Iben:2003:SST,
author = "I. E. T. Iben and Y.-M. Lee and W. D. Hsiao",
title = "Steady-state thermal characteristics of {AMR}
read\slash write heads used in tape storage drives",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "401--414",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/lee.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Iben:2003:HRA,
author = "I. E. T. Iben",
title = "Head reliability of {AMR} sensors based on thermal
stress tests",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "415--428",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/iben.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Jaquette:2003:LBF,
author = "G. A. Jaquette",
title = "{LTO}: a better format for mid-range tape",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "429--444",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/jaquette.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Hellman:2003:ITS,
author = "D. J. Hellman and R. Yardy and P. E. Abbott",
title = "Innovations in tape storage automation at {IBM}",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "445--452",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/hellman.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Deicke:2003:TMS,
author = "J. Deicke and W. Mueller",
title = "Tape management in a storage networking environment",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "453--457",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/deicke.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Kishi:2003:IVT,
author = "G. T. Kishi",
title = "The {IBM Virtual Tape Server}: Making tape controllers
more autonomic",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "459--469",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/kishi.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Childers:2003:SOM,
author = "E. R. Childers and W. Imaino and J. H. Eaton and G. A.
Jaquette and P. V. Koeppe and D. J. Hellman",
title = "Six orders of magnitude in linear tape technology: The
one-terabyte project",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "471--482",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/childers.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Ortega:2003:GED,
author = "A. Ortega and A. A. Dalhoum and M. Alfonseca",
title = "Grammatical evolution to design fractal curves with a
given dimension",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "483--493",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/ortega.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Matick:2003:CAP,
author = "R. E. Matick",
title = "Comparison of analytic performance models using closed
mean-value analysis versus open-queuing theory for
estimating cycles per instruction of memory
hierarchies",
journal = j-IBM-JRD,
volume = "47",
number = "4",
pages = "495--517",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Aug 7 13:37:16 MDT 2003",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/474/matick.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0236",
}
@Article{Elnozahy:2003:P,
author = "G. N. Elnozahy and R. Joshis",
title = "Preface",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "521--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Nakagome:2003:RFP,
author = "Y. Nakagome and M. Horiguchi and T. Kawahara and K.
Itoh",
title = "Review and future prospects of low-voltage {RAM}
circuits",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "525--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/nakagome.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Mann:2003:UPS,
author = "R. W. Mann and W. W. Abadeer and M. J. Breitwisch and
O. Bula and J. S. Brown and B. C. Colwill and P. E.
Cottrell and W. T. Crocco and S. S. Furkay and M. J.
Hauser and T. B. Hook and D. Hoyniak and J. M. Johnson
and C. M. Lam and R. D. Mih and J. Rivard and A.
Moriwaki and E. Phipps and C. S. Putnam and B. A.
Rainey and J. J. Toomey and M. I. Younus",
title = "Ultralow-power {SRAM} technology",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "553--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/mann.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Oklobdzija:2003:CSE,
author = "V. G. Oklobdzija",
title = "Clocking and storage elements in a multi-gigahertz
environment",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "567--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/oklobdzija.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Zyuban:2003:BHI,
author = "V. Zyuban and P. N. Strenski",
title = "Balancing hardware intensity in microprocessor
pipelines",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "585--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/zyuban.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Kim:2003:FGR,
author = "S. Kim and C. H. Ziesler and M. C. Papaefthymiou",
title = "Fine-grain real-time reconfigurable pipelining",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "599--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/kim.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Plouchart:2003:ASM,
author = "J.-O. Plouchart and N. Zamdmer and J. Kim and M.
Sherony and Y. Tan and A. Ray and M. Talbi and L. F.
Wagner and K. Wu and N. E. Lustig and S. Narasimha and
P. O'Neil and N. Phan and M. Rohn and J. Strom and D.
M. Friend and S. V. Kosonocky and D. R. Knebel and S.
Kim and K. A. Jenkins and M. M. Rivier",
title = "Application of an {SOI} 0.12-$\mu$m {CMOS} technology
to {SoCs} with low-power and high-frequency circuits",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "611--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/plouchart.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Nowka:2003:DAP,
author = "K. J. Nowka and G. D. Carpenter and B. C. Brock",
title = "The design and application of the {PowerPC 405LP}
energy-efficient system-on-a-chip",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "631--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/nowka.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Shafi:2003:DVP,
author = "H. Shafi and P. J. Bohrer and J. Phelan and C. A. Rusu
and J. L. Peterson",
title = "Design and validation of a performance and power
simulator for {PowerPC} systems",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "641--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/shafi.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Brooks:2003:NME,
author = "D. Brooks and P. Bose and V. Srinivasan and M. K.
Gschwind and P. G. Emma and M. G. Rosenfield",
title = "New methodology for early-stage,
microarchitecture-level power-performance analysis of
microprocessors",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "653--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/brooks.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Felter:2003:PUD,
author = "W. M. Felter and T. W. Keller and M. D. Kistler and C.
Lefurgy and K. Rajamani and R. Rajamony and F. L.
Rawson and B. A. Smith and E. {Van Hensbergen}",
title = "On the performance and use of dense servers",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "671--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/felter.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Rusu:2003:MSV,
author = "C. A. Rusu and R. Melhem and D. Moss{\'e}",
title = "Maximizing the system value while satisfying time and
energy constraints",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "689--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/rusu.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Bradley:2003:WBP,
author = "D. J. Bradley and R. E. Harper and S. W. Hunter",
title = "Workload-based power management for parallel computer
systems",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "703--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/bradley.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Anonymous:2003:AIV,
author = "Anonymous",
title = "Author index for Volume 47",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "719--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/authv47.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Anonymous:2003:SIV,
author = "Anonymous",
title = "Subject index for Volume 47",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "725--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/subjv47.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{Rosenfield:2003:MDA,
author = "Michael G. Rosenfield",
title = "Message from the {Director, Austin Research
Laboratory, IBM Research Division}",
journal = j-IBM-JRD,
volume = "47",
number = "5/6",
pages = "??--??",
month = "????",
year = "2003",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/475/message.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0237",
}
@Article{DiVincenzo:2004:P,
author = "D. DiVincenzo and N. Amer",
title = "Preface",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "3--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Grinstein:2004:CCS,
author = "G. Grinstein",
title = "Can complex structures be generically stable in a
noisy world?",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "5--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/grinstein.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Toffoli:2004:PIS,
author = "T. Toffoli",
title = "A pedestrian's introduction to spacetime
crystallography",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "13--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/toffoli.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Fredkin:2004:FBQ,
author = "E. Fredkin",
title = "Five big questions with pretty simple answers",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "31--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/fredkin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Smolin:2004:EDE,
author = "J. A. Smolin",
title = "The early days of experimental quantum cryptography",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "47--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/smolin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Mermin:2004:CCH,
author = "N. D. Mermin",
title = "{Copenhagen} computation: How {I} learned to stop
worrying and love {Bohr}",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "53--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/mermin.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Peres:2004:WAT,
author = "A. Peres",
title = "What is actually teleported?",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "63--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/peres.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Terhal:2004:EM,
author = "B. M. Terhal",
title = "Is entanglement monogamous?",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "71--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/terhal.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Jozsa:2004:ICQ,
author = "R. Jozsa",
title = "Illustrating the concept of quantum information",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "79--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/jozsa.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Brassard:2004:TGQ,
author = "G. Brassard and P. Horodecki and T. Mor",
title = "{TelePOVM} --- a generalized quantum teleportation
scheme",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "87--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/brassard.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Wootters:2004:PQP,
author = "W. K. Wootters",
title = "Picturing qubits in phase space",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "99--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/wootters.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Ruskai:2004:SBS,
author = "M. B. Ruskai",
title = "Some bipartite states do not arise from channels",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "111--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/ruskai.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Shor:2004:ACC,
author = "P. W. Shor",
title = "The adaptive classical capacity of a quantum channel,
or Information capacities of three symmetric pure
states in three dimensions",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "115--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/shor.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Horodecki:2004:QII,
author = "R. Horodecki and M. Horodecki and P. Horodecki",
title = "Quantum information isomorphism: Beyond the dilemma of
the {Scylla} of ontology and the {Charybdis} of
instrumentalism",
journal = j-IBM-JRD,
volume = "48",
number = "1",
pages = "139--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 27 05:37:12 MST 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/481/horodecki.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0238",
}
@Article{Agerwala:2004:MVP,
author = "Tilak Agerwala",
title = "Message from the {Vice President, Systems, IBM
Research Division}",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "??--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.a",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Jordan:2004:P,
author = "Kirk E. Jordan",
title = "Preface",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "151--152",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0151",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Crivelli:2004:NLB,
author = "S. Crivelli and T. Head-Gordon",
title = "A new load-balancing strategy for the solution of
dynamical large-tree-search problems using a
hierarchical approach",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "153--160",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0153",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/crivelli.html;
http://www.research.ibm.com/journal/rd/482/crivelli.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Fann:2004:SOM,
author = "G. Fann and G. Beylkin and R. J. Harrison and K. E.
Jordan",
title = "Singular operators in multiwavelet bases",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "161--172",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0161",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/fann.html;
http://www.research.ibm.com/journal/rd/482/fann.pdf",
abstract = "We review some recent results on multiwavelet methods
for solving integral and partial differential equations
and present an efficient representation of operators
using discontinuous multiwavelet bases, including the
case for singular integral operators. Numerical
calculus using these representations produces fast
$O(N)$ methods for multiscale solution of integral
equations when combined with low separation rank
methods. Using this formulation, we compute the Hilbert
transform and solve the Poisson and Schr{\"o}dinger
equations. For a fixed order of multiwavelets and for
arbitrary but finite precision computations, the
computational complexity is $O(N)$. The computational
structures are similar to fast multipole methods but
are more generic in yielding fast $O(N)$ algorithm
development.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Newns:2004:NET,
author = "D. M. Newns and W. E. Donath and G. J. Martyna and M.
E. Schabes and B. H. {Lengsfield III}",
title = "Novel efficient techniques for computer simulation of
magnetic recording",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "173--182",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0173",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/newns.html;
http://www.research.ibm.com/journal/rd/482/newns.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Lake:2004:PWN,
author = "G. Lake and T. Quinn and D. C. Richardson and J.
Stadel",
title = "The pursuit of the whole {NChilada}: Virtual petaflops
using multi-adaptive algorithms for gravitational
systems",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "183--198",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0183",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/lake.html;
http://www.research.ibm.com/journal/rd/482/lake.pdf",
abstract = "``The orbit of any one planet depends on the combined
motion of all the other planets, not to mention the
actions of all these on each other. To consider
simultaneously all these causes of motion and to define
these motions by exact laws allowing of convenient
calculation exceeds, unless I am mistaken, the forces
of the entire human intellect.'' --- Isaac Newton,
1687\par
We describe the keys to meeting the challenges of
$N$-body simulation: adaptive potential solvers,
adaptive integration, and volume renormalization. With
these techniques and a dedicated teraflop facility,
simulation can keep pace with observations of the
universe. We also describe some problems in simulating
the formation and stability of planetary systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Elmegreen:2004:SMM,
author = "B. G. Elmegreen and R. H. Koch and M. E. Schabes and
T. Crawford and T. Ebisuzaki and H. Furusawa and T.
Narumi and R. Susukita and K. Yasuoka",
title = "Simulations of magnetic materials with {MDGRAPE-2}",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "199--207",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0199",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/elmegreen.html;
http://www.research.ibm.com/journal/rd/482/elmegreen.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Kramer:2004:DSC,
author = "W. T. C. Kramer and A. Shoshani and D. A. Agarwal and
B. R. Draney and G. Jin and G. F. Butler and J. A.
Hules",
title = "Deep scientific computing requires deep data",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "209--232",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0209",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/kramer.html;
http://www.research.ibm.com/journal/rd/482/kramer.pdf",
abstract = "Increasingly, scientific advances require the fusion
of large amounts of complex data with extraordinary
amounts of computational power. The problems of deep
science demand deep computing and deep storage
resources. In addition to teraflop-range computing
engines with their own local storage, facilities must
provide large data repositories of the order of 10--100
petabytes, and networking to allow the movement of
multi-terabyte files in a timely and secure manner.
This paper examines such problems and identifies
associated challenges. The paper discusses some of the
storage systems and data management methods that are
needed for computing facilities to address the
challenges and describes some ongoing improvements.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Grimshaw:2004:PTC,
author = "A. S. Grimshaw and M. A. Humphrey and A. Natrajan",
title = "A philosophical and technical comparison of {Legion}
and {Globus}",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "233--254",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0233",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/grimshaw.html;
http://www.research.ibm.com/journal/rd/482/grimshaw.pdf",
abstract = "Grids are collections of interconnected resources
harnessed to satisfy various needs of users. Legion and
Globus are pioneering grid technologies. Several of the
aims and goals of both projects are similar, yet their
underlying architectures and philosophies differ
substantially. The scope of both projects is the
creation of worldwide grids; in that respect, they
subsume several distributed systems technologies.
However, Legion has been designed as a virtual
operating system (OS) for distributed resources with
OS-like support for current and expected future
interactions among resources, whereas Globus has long
been designed as a sum of services infrastructure, in
which tools are developed independently in response to
current needs of users. We compare and contrast Legion
and Globus in terms of their underlying philosophy and
the resulting architectures, and we discuss how these
projects converge in the context of the new standards
being formulated for grids.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Hsu:2004:PIO,
author = "W. W. Hsu and A. J. Smith",
title = "The performance impact of {I/O} optimizations and disk
improvements",
journal = j-IBM-JRD,
volume = "48",
number = "2",
pages = "255--289",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.482.0255",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:39 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/482/hsu.html;
http://www.research.ibm.com/journal/rd/482/hsu.pdf",
abstract = "In this paper, we use real server and personal
computer workloads to systematically analyze the true
performance impact of various I/O optimization
techniques, including read caching, sequential
prefetching, opportunistic prefetching, write
buffering, request scheduling, striping, and
short-stroking. We also break down disk technology
improvement into four basic effects faster seeks,
higher RPM, linear density improvement, and increase in
track density and analyze each separately to determine
its actual benefit. In addition, we examine the
historical rates of improvement and use the trends to
project the effect of disk technology scaling. As part
of this study, we develop a methodology for replaying
real workloads that more accurately models I/O arrivals
and that allows the I/O rate to be more realistically
scaled than previously. We find that optimization
techniques that reduce the number of physical I/Os are
generally more effective than those that improve the
efficiency in performing the I/Os. Sequential
prefetching and write buffering are particularly
effective, reducing the average read and write response
time by about 50\% and 90\%, respectively. Our results
suggest that a reliable method for improving
performance is to use larger caches up to and even
beyond 1\% of the storage used. For a given workload,
our analysis shows that disk technology improvement at
the historical rate increases performance by about 8\%
per year if the disk occupancy rate is kept constant,
and by about 15\% per year if the same number of disks
are used. We discover that the actual average seek time
and rotational latency are, respectively, only about
35\% and 60\% of the specified values. We also observe
that the disk head positioning time far dominates the
data transfer time, suggesting that to effectively
utilize the available disk bandwidth, data should be
reorganized such that accesses become more
sequential.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0239",
}
@Article{Desens:2004:MVP,
author = "Michael Desens",
title = "Message from the {Vice President, Systems Hardware
Development, IBM Systems and Technology Group}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "??--??",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.a",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/message.html;
http://www.research.ibm.com/journal/rd/483/message.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Schmidt:2004:P,
author = "Rolf Schmidt",
title = "Preface",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "293--294",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0293",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/preface.html;
http://www.research.ibm.com/journal/rd/483/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Slegel:2004:IEZ,
author = "T. J. Slegel and E. Pfeffer and J. A. Magee",
title = "The {IBM eServer z990} microprocessor",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "295--310",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0295",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/slegel.html;
http://www.research.ibm.com/journal/rd/483/slegel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Gerwig:2004:IEZ,
author = "G. Gerwig and H. Wetter and E. M. Schwarz and J. Haess
and C. A. Krygowski and B. M. Fleischer and M.
Kroener",
title = "The {IBM eServer z990} floating-point unit",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "311--322",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0311",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/gerwig.html;
http://www.research.ibm.com/journal/rd/483/gerwig.pdf",
abstract = "The floating-point unit (FPU) of the IBM z990 eServer
is the first one in an IBM mainframe with a fused
multiply-add dataflow. It also represents the first
time that an SRT divide algorithm (named after Sweeney,
Robertson, and Tocher, who independently proposed the
algorithm) was used in an IBM mainframe. The FPU
supports dual architectures: the zSeries hexadecimal
floating-point architecture and the IEEE 754 binary
floating-point architecture. Six floating-point formats
including short, long, and extended operands are
supported in hardware. The throughput of this FPU is
one multiply-add operation per cycle. The instructions
are executed in five pipeline steps, and there are
multiple provisions to avoid stalls in case of data
dependencies. It is able to handle denormalized input
operands and denormalized results without a stall
(except for architectural program exceptions). It has a
new extended-precision divide and square-root dataflow.
This dataflow uses a radix-4 SRT algorithm (radix-2 for
square root) and is able to handle divides and
square-root operations in multiple floating-point and
fixed-point formats. For fixed-point divisions, a new
mechanism improves the performance by using an
algorithm with which the number of divide iterations
depends on the effective number of quotient bits.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Mak:2004:PSI,
author = "P. Mak and G. E. Strait and M. A. Blake and K. W. Kark
and V. K. Papazova and A. E. Seigler and G. A. {Van
Huben} and L. Wang and G. C. Wellwood",
title = "Processor subsystem interconnect architecture for a
large symmetric multiprocessing system",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "323--338",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0323",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/mak.html;
http://www.research.ibm.com/journal/rd/483/mak.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Webel:2004:RCM,
author = "T. Webel and T. E. Gilbert and D. Schmunkamp",
title = "Run-control migration from single book to multibooks",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "339--346",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0339",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/webel.html;
http://www.research.ibm.com/journal/rd/483/webel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Bair:2004:FVZ,
author = "D. G. Bair and S. M. German and W. D. Wollyung and E.
J. {Kaminski, Jr.} and J. Schafer and M. P. Mullen and
W. J. Lewis and R. Wisniewski and J. Walter and S.
Mittermaier and V. Vokhshoori and R. J. Adkins and M.
Halas and T. Ruane and U. Hahn",
title = "Functional verification of the {z990} superscalar,
multibook microprocessor complex",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "347--365",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0347",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/bair.html;
http://www.research.ibm.com/journal/rd/483/bair.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Anderson:2004:CSS,
author = "H.-W. Anderson and H. Kriese and W. Roesner and K.-D.
Schubert",
title = "Configurable system simulation model build comprising
packaging design data",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "367--378",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/anderson.html;
http://www.research.ibm.com/journal/rd/483/anderson.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Winkel:2004:FSL,
author = "T.-M. Winkel and W. D. Becker and H. Harrer and H.
Pross and D. Kaller and B. Garben and B. J. Chamberlin
and S. A. Kuppinger",
title = "First- and second-level packaging of the {z990}
processor cage",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "379--394",
month = "????",
year = "2004",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/winkel.html;
http://www.research.ibm.com/journal/rd/483/winkel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Parrilla:2004:PIE,
author = "J. C. Parrilla and F. E. Bosco and J. S. Corbin and J.
J. Loparco and P. Singh and J. G. Torok",
title = "Packaging the {IBM eServer z990} central electronic
complex",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "395--407",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0395",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/parrilla.html;
http://www.research.ibm.com/journal/rd/483/parrilla.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Goth:2004:HCC,
author = "G. F. Goth and D. J. Kearney and U. Meyer and D. W.
Porter",
title = "Hybrid cooling with cycle steering in the {IBM eServer
z990}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "409--423",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0409",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/goth.html;
http://www.research.ibm.com/journal/rd/483/goth.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Heller:2004:MIZ,
author = "L. C. Heller and M. S. Farrell",
title = "Millicode in an {IBM zSeries} processor",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "425--434",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0425",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/heller.html;
http://www.research.ibm.com/journal/rd/483/heller.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Axnix:2004:ZNP,
author = "C. Axnix and E. Engler and S. Hegewald and T. Hesmer
and M. Kuenzel and F. M. Welter",
title = "{z990 NetMessage}-protocol-based processor to support
element communication interface",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "435--447",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0435",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/axnix.html;
http://www.research.ibm.com/journal/rd/483/axnix.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Chencinski:2004:SCL,
author = "E. W. Chencinski and M. J. Becht and T. E. Bubb and C.
G. Burwick and J. Haess and M. M. Helms and J. M. Hoke
and T. Schlipf and J. M. Turner and H. Ulland and M. H.
Walz and C. H. Whitehead and G. Zilles",
title = "The structure of chips and links comprising the {IBM
eServer z990 I/O} subsystem",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "449--459",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0449",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/chencinski.html;
http://www.research.ibm.com/journal/rd/483/chencinski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Hoppe:2004:FVF,
author = "B. Hoppe and B. Arthur-Mensah and E. W. Chencinski and
S. Joseph and H. Kumar and J. F. Silverio",
title = "Functional verification of a frequency-programmable
switch chip with asynchronous clock sections",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "461--474",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0461",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/hoppe.html;
http://www.research.ibm.com/journal/rd/483/hoppe.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Arnold:2004:IPN,
author = "T. W. Arnold and L. P. {Van Doorn}",
title = "The {IBM PCIXCC}: a new cryptographic coprocessor
for the {IBM eServer}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "475--487",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0475",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/arnold.html;
http://www.research.ibm.com/journal/rd/483/arnold.pdf",
abstract = "IBM has designed special cryptographic processors for
its servers for more than 25 years. These began as very
simple devices, but over time the requirements have
become increasingly complex, and there has been a
never-ending demand for increased speed. This paper
describes the PCIXCC, the new coprocessor introduced in
the IBM z990 server. In many ways, PCIXCC is a
watershed design. For the first time, a single product
satisfies all requirements across all IBM server
platforms. It offers the performance demanded by
today's Web servers, it supports the complex and
specialized cryptographic functions needed in the
banking and finance industry, and it uses packaging
technology that leads the world in resistance to
physical or electrical attacks against its secure
processes and the secret data it holds. Furthermore, it
is programmable and highly flexible, so that its
function can be easily modified to meet new
requirements as they appear. These features are
possible because of innovative design in both the
hardware and embedded software for the card. This paper
provides an overview of that design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
remark = "From the paper: ``Random-number generator: The card
includes two cryptographic-quality hardware
random-number generators. The entropy is obtained from
electrical noise from a semiconductor junction. Each of
the two random-number sources provides random bits at a
rate of 128 Kb/s.''\par
Linux operating system and device drivers: \ldots{} By
adopting Linux as the card O/S, the PCIXCC development
team could focus more of its energy on the unique
PCIXCC components. \ldots{} In the end, we decided to
provide all device driver modules under the same
license as the Linux kernel, the GNU General Public
License (GPL).",
}
@Article{Wyman:2004:MLC,
author = "L. W. Wyman and H. M. Yudenfriend and J. S. Trotter
and K. J. Oakes",
title = "Multiple-logical-channel subsystems: Increasing
{zSeries I/O} scalability and connectivity",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "489--505",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0489",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/wyman.html;
http://www.research.ibm.com/journal/rd/483/wyman.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Banzhaf:2004:SIP,
author = "G. Banzhaf and F. W. Brice and G. R. Frazier and J. P.
Kubala and T. B. Mathias and V. Sameske",
title = "{SCSI} initial program loading for {zSeries}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "507--518",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0507",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/banzhaf.html;
http://www.research.ibm.com/journal/rd/483/banzhaf.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Fair:2004:RAS,
author = "M. L. Fair and C. R. Conklin and S. B. Swaney and P.
J. Meaney and W. J. Clarke and L. C. Alves and I. N.
Modi and F. Freier and W. Fischer and N. E. Weber",
title = "Reliability, availability, and serviceability ({RAS})
of the {IBM eServer z990}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "519--534",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0519",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/fair.html;
http://www.research.ibm.com/journal/rd/483/fair.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Siegel:2004:LPM,
author = "I. G. Siegel and B. A. Glendening and J. P. Kubala",
title = "Logical partition mode physical resource management on
the {IBM eServer z990}",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "535--541",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0535",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/siegel.html;
http://www.research.ibm.com/journal/rd/483/siegel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Gellerich:2004:GBP,
author = "W. Gellerich and T. Hendel and R. Land and H. Lehmann
and M. Mueller and P. H. Oden and H. Penner",
title = "The {GNU} 64-bit {PL8} compiler: Toward an open
standard environment for firmware development",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "543--556",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0543",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/gellerich.html;
http://www.research.ibm.com/journal/rd/483/gellerich.pdf",
abstract = "For two decades, large parts of zSeries firmware have
been written in the PL8 programming language. The
existence of a large amount of mature zSeries firmware
source code and our excellent experience with PL8 for
system programming suggest keeping this language.
However, the firmware address space of today's zSeries
servers may exceed 2 GB, raising the need for a new
64-bit PL8 compiler, since the original implementation,
developed at the IBM Thomas J. Watson Research Center,
Yorktown Heights, New York, supports only 32-bit
platforms. The GNU compiler collection (GCC) (GNU is a
freeware UNIX -like operating system) has been used to
translate those parts of firmware written in C for some
years and has also proved successful in compiling Linux
for zSeries. This fact, combined with the highly
modular GCC design, suggested reimplementing PL8 within
the GCC framework. In this paper, we report on the
extension of PL8 to support 64-bit addressing, its
implementation as a GCC front end, and the validation
of the new compiler. We also evaluate PL8 as a language
for highly reliable low-level programming and give some
performance data. The paper documents the high level of
quality achieved by the GCC open-source project and how
such software fits into the traditional IBM software
development processes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Koerner:2004:ZFE,
author = "S. Koerner and R. Bawidamann and W. Fischer and U.
Helmich and D. Klodt and B. K. Tolan and P. Wojciak",
title = "The {z990} first error data capture concept",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "557--568",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0557",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/koerner.html;
http://www.research.ibm.com/journal/rd/483/koerner.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Schubert:2004:ASI,
author = "K.-D. Schubert and E. C. McCain and H. Pape and K.
Rebmann and P. M. West and R. Winkelmann",
title = "Accelerating system integration by enhancing hardware,
firmware, and co-simulation",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "569--581",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0569",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/schubert.html;
http://www.research.ibm.com/journal/rd/483/schubert.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Stetter:2004:IEZ,
author = "M. Stetter and J. von Buttlar and P. T. Chan and D.
Decker and H. Elfering and P. M. Gioquindo and T. Hess
and S. Koerner and A. Kohler and H. Lindner and K.
Petri and M. Zee",
title = "{IBM eServer z990} improvements in firmware
simulation",
journal = j-IBM-JRD,
volume = "48",
number = "3/4",
pages = "583--594",
month = "????",
year = "2004",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.483.0583",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 28 06:50:40 MDT 2004",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/483/stetter.html;
http://www.research.ibm.com/journal/rd/483/stetter.pdf",
abstract = "With the IBM eServer z900, simulation methods and
tools for verification of code that is to be embedded
in the memory of the system (firmware) were introduced.
Since that time, firmware developers have simulated
their code prior to the availability of new system
hardware components, thereby reducing the time required
to bring a large computer system to market. With the
z990 system, code simulation efficiency has been
improved. The simulation coverage for host and service
firmware has been increased from approximately 60\% in
the z900 to 85\% in the z990 by introducing new concepts
and extensions. For the first time, the central
electronic complex (CEC) firmware simulator, CECSIM,
has been enabled to run code in a logical partition
(LPAR). This was a prerequisite for code verification
of the intra-CEC connectivity, HiperSockets. For
verification of HiperSockets, a Linux operating system
is loaded into an LPAR. Code verification is
accomplished more easily, more effectively, and with
better coverage using Linux debugging features because
of the ease of performing functional tests with Linux.
Another major improvement was the connection of the
channel code simulator for the networking I/O adapter
OSA-Express to the CECSIM environment to provide a
comprehensive verification that covers the entire path
of firmware interaction between the CEC and the I/O
channels. For the simulation of card control code, a
combined software and hardware verification approach
was introduced. The overall functionality was verified
with a system simulation model, and the base hardware
accesses were verified by attaching real hardware. In
addition, the cage controller code was integrated into
the simulation environment. As a result, the firmware
interfaces between the support element (SE) and the
cage controller as well as between the cage controller
and the hardware have been tested.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Anonymous:2005:EN,
author = "Anonymous",
title = "Editor's Note",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "??--??",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/note.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
remark = "This issue is dedicated to the late Dr. Panayotis
Andricacos of the IBM Thomas J. Watson Research Center,
who played a pioneering role in the development of
copper electrodeposition for semiconductor on-chip
wiring.",
}
@Article{Vereecken:2005:CAD,
author = "P. M. Vereecken and R. A. Binstead and H. Deligianni
and P. C. Andricacos",
title = "The chemistry of additives in damascene copper
plating",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "3--18",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/vereecken.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Moffat:2005:SFG,
author = "T. P. Moffat and D. Wheeler and M. D. Edelstein and D.
Josell",
title = "Superconformal film growth: Mechanism and
quantification",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "19--36",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/moffat.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{West:2005:EPI,
author = "A. C. West and H. Deligianni and P. C. Andricacos",
title = "Electrochemical planarization of interconnect
metallization",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "37--48",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/west.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Drews:2005:MSC,
author = "T. O. Drews and S. Krishnan and J. C. {Alameda, Jr.}
and D. Gannon and R. D. Braatz and R. C. Alkire",
title = "Multiscale simulations of copper electrodeposition
onto a resistive substrate",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "49--63",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/drews.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Ritzdorf:2005:DME,
author = "T. L. Ritzdorf and G. J. Wilson and P. R. McHugh and
D. J. Woodruff and K. M. Hanson and D. Fulton",
title = "Design and modeling of equipment used in
electrochemical processes for microelectronics",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "65--77",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/ritzdorf.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Sun:2005:TPM,
author = "L. Sun and Y. Hao and C.-L. Chien and P. C. Searson",
title = "Tuning the properties of magnetic nanowires",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "79--102",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/sun.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Cooper:2005:RDH,
author = "E. I. Cooper and C. Bonh{\^o}te and J. Heidmann and Y.
Hsu and P. Kern and J. Lam and M. Ramasubramanian and
N. Robertson and L. T. Romankiw and H. Xu",
title = "Recent developments in high-moment electroplated
materials for recording heads",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "103--126",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/cooper.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Emma:2005:ELP,
author = "P. G. Emma and A. Hartstein and T. R. Puzak and V.
Srinivasan",
title = "Exploring the limits of prefetching",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "127--144",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/emma.pdf",
abstract = "We formulate a new approach for evaluating a
prefetching algorithm. We first carry out a profiling
run of a program to identify all of the misses and
corresponding locations in the program where prefetches
for the misses can be initiated. We then systematically
control the number of misses that are prefetched, the
timeliness of these prefetches, and the number of
unused prefetches. We validate the accuracy of our
approach by comparing it to one based on a Markov
prefetch algorithm. This allows us to measure the
potential benefit that any application can receive from
prefetching and to analyze application behavior under
conditions that cannot be explored with any known
prefetching algorithm. Next, we analyze a system
parameter that is vital to prefetching performance, the
line transfer interval, which is the number of
processor cycles required to transfer a cache line.
This interval is determined by technology and
bandwidth. We show that under ideal conditions,
prefetching can remove nearly all of the stalls
associated with cache misses. Unfortunately, real
processor implementations are less than ideal. In
particular, the trend in processor frequency is
outrunning on-chip and off-chip bandwidths. Today, it
is not uncommon for processor frequency to be three or
four times bus frequency. Under these conditions, we
show that nearly all of the performance benefits
derived from prefetching are eroded, and in many cases
prefetching actually degrades performance. We carry out
quantitative and qualitative analyses of these
tradeoffs and show that there is a linear relationship
between overall performance and three metrics:
percentage of misses prefetched, percentage of unused
prefetches, and bandwidth.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
remark = "From p. 142: ``In many processors today, line sizes
are modest (e.g., 32 bytes), bus widths are
sufficiently matched to the line size (e.g., 8 bytes),
and processor frequency is comparable to bus frequency
(e.g., 1:1 or 2:1). For such systems, the LTI is small
(e.g., four cycles) but still measurable. However, the
factors that drive packaging technology and logic speed
and density will cause LTI to increase, resulting in
serious effects that could render prefetching useless.
We have shown this trend even at high levels of
coverage and accuracy.''",
}
@Article{Matick:2005:LBE,
author = "R. E. Matick and S. E. Schuster",
title = "Logic-based {eDRAM}: Origins and rationale for use",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "145--165",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/matick.pdf",
abstract = "The IBM logic-based eDRAM (embedded DRAM) technology
integrates a trench DRAM (dynamic random access memory)
storage-cell technology into a logic-circuit
technology, merging the two previously separate
technologies. Since its introduction in the 1970s, the
DRAM technology has been driven by cost while the logic
technology has been driven by speed, leading to an
ever-widening gap between slower memory and faster
logic devices. That has led to the need for
increasingly complex levels of memory hierarchies,
resulting in considerable degradation of system
performance despite many design and architecture
compromises. DRAM can provide six to eight times as
much memory as SRAM (static random access memory) in
the same area, but has been too slow to be used at any
cache level. Our studies, highlighted in this paper,
indicated that the use of logic-based DRAM could
resolve that difficulty and was necessary for
integrating systems on a chip. This has led to the
inclusion of logic-based eDRAM as a memory option in
the IBM ASICs (application-specific integrated
circuits) product.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Buti:2005:OIR,
author = "T. N. Buti and R. G. McDonald and Z. Khwaja and A.
Ambekar and H. Q. Le and W. E. Burky and B. Williams",
title = "Organization and implementation of the
register-renaming mapper for out-of-order {IBM POWER4}
processors",
journal = j-IBM-JRD,
volume = "49",
number = "1",
pages = "167--188",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 07:50:44 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/491/buti.pdf",
abstract = "We present a new nonconventional approach for
designing and organizing register rename mappers that
can be applied in modern out-of-order processor chips.
A content-addressable memory (CAM) configuration
optimal for such a register mapper application was
developed. The structure of the CAM and search engine,
described in this paper, facilitates the implementation
of the register mapper as a group of custom arrays.
Each array is dedicated to executing a specific
function. Among the functions we implemented are
allocation of registers, maintaining the register map
and status, source lookup, saving a shadow copy of the
register map, and freeing up of registers. We made a
novel implementation of the register mapper to provide
rename resources for the IBM POWER4 chip, which
provides the processing power for the IBM eServer p690.
Such register renaming allows for a high level of
concurrency in the pipeline and contributes to superior
machine performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Agerwala:2005:MVP,
author = "Tilak Agerwala",
title = "Message from the {Vice President, Systems, IBM
Research Division}",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "??--??",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "01 June 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/message.pdf",
abstract = "The Blue Gene program was announced in 1999, with the
long-term goal of creating a petascale supercomputer to
accelerate discovery in the life sciences. Five years
later, the team of IBM researchers and developers, in
collaboration with the Lawrence Livermore National
Laboratory, has delivered a computer (Blue Gene/L) that
not only ranks as the most powerful supercomputer in
the world, but introduces dramatic reductions in power
consumption, cost, and space requirements. A vigorous,
innovative, collaborative scientific research program
based on Blue Gene is now in place as well.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Chiu:2005:P,
author = "G. L.-T. Chiu and M. Gupta and A. K. Royyurus",
title = "Preface",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "191--193",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/preface.pdf",
abstract = "On November 8, 2004, a 16-rack, 16,384-node Blue
Gene/L supercomputer was crowned as the fastest
supercomputer in the world on the 24th TOP500 list
(http://www.top500.org). IBM was regarded as the most
innovative computer manufacturer. The sustained LINPACK
benchmark number for this Blue Gene/L was 70.72
teraflops (a trillion floating-point operations per
second), or 77\% of its peak performance of 91.75
teraflops.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Gara:2005:OBG,
author = "A. Gara and M. A. Blumrich and D. Chen and G. L.-T.
Chiu and P. Coteus and M. E. Giampapa and R. A. Haring
and P. Heidelberger and D. Hoenicke and G. V. Kopcsay
and T. A. Liebsch and M. Ohmacht and B. D.
Steinmacher-Burow and T. Takken and P. Vranas",
title = "Overview of the {Blue Gene/L} system architecture",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "195--212",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/gara.pdf",
abstract = "The Blue Gene/L computer is a massively parallel
supercomputer based on IBM system-on-a-chip technology.
It is designed to scale to 65,536 dual-processor nodes,
with a peak performance of 360 teraflops. This paper
describes the project objectives and provides an
overview of the system architecture that resulted. We
discuss our application-based approach and rationale
for a low-power, highly integrated design. The key
architectural features of Blue Gene/L are introduced in
this paper: the link chip component and five Blue
Gene/L networks, the PowerPC 440 core and
floating-point enhancements, the on-chip and off-chip
distributed memory system, the node- and system-level
design for high reliability, and the comprehensive
approach to fault isolation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Coteus:2005:PBG,
author = "P. Coteus and H. R. Bickford and T. M. Cipolla and P.
G. Crumley and A. Gara and S. A. Hall and G. V. Kopcsay
and A. P. Lanzetta and L. S. Mok and R. Rand and R.
Swetz and T. Takken and P. La Rocca and C. Marroquin
and P. R. Germann and M. J. Jeanson",
title = "Packaging the {Blue Gene/L} supercomputer",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "213--248",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/coteus.pdf",
abstract = "As 1999 ended, IBM announced its intention to
construct a one peta flop supercomputer. The
construction of this system was based on a cellular
architecture the use of relatively small but powerful
building blocks used together in sufficient quantities
to construct large systems. The first step on the road
to a petaflop machine (one quadrillion floating-point
operations in a second) is the Blue Gene/L
supercomputer. Blue Gene/L combines a low-power
processor with a highly parallel architecture to
achieve unparalleled computing performance per unit
volume. Implementing the Blue Gene/L packaging involved
trading off considerations of cost, power, cooling,
signaling, electromagnetic radiation, mechanics,
component selection, cabling, reliability, service
strategy, risk, and schedule. This paper describes how
1,024 dual-processor compute application-specific
integrated circuits (ASICs) are packaged in a scalable
rack, and how racks are combined and augmented with
host computers and remote storage. The Blue Gene/L
interconnect, power, cooling, and control systems are
described individually and as part of the synergistic
whole.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Wait:2005:IPF,
author = "C. D. Wait",
title = "{IBM PowerPC 440 FPU} with complex-arithmetic
extensions",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "249--254",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/wait.pdf",
abstract = "The PowerPC 440 floating-point unit (FPU) with
complex-arithmetic extensions is an embedded
application-specific integrated circuit (ASIC) core
designed to be used with the IBM PowerPC 440 processor
core on the Blue Gene/L compute chip. The FPU core
implements the floating-point instruction set from the
PowerPC Architecture and the floating-point instruction
extensions created to aid in matrix and
complex-arithmetic operations. The FPU instruction
extensions define double-precision operations that are
primarily single-instruction multiple-data (SIMD) and
require two (primary and secondary) arithmetic
pipelines and floating-point register files. However,
to aid complex-arithmetic routines, some FPU extensions
actually perform different (yet closely related)
operations while executing in the arithmetic pipelines.
The FPU core implements an operand crossbar between the
primary and secondary arithmetic datapaths to enable
each pipeline operand access from the primary or
secondary register file. The PowerPC 440 processor core
provides 128-bit storage buses and simultaneous issue
of an arithmetic instruction with a storage
instruction, allowing the FPU core to fully utilize the
parallel arithmetic pipes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Ohmacht:2005:BGC,
author = "M. Ohmacht and R. A. Bergamaschi and S. Bhattacharya
and A. Gara and M. E. Giampapa and B. Gopalsamy and R.
A. Haring and D. Hoenicke and D. J. Krolak and J. A.
Marcella and B. J. Nathanson and V. Salapura and M. E.
Wazlowski",
title = "{Blue Gene/L} compute chip: Memory and {Ethernet}
subsystem",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "255--264",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/ohmacht.pdf",
abstract = "The Blue Gene/L compute chip is a dual-processor
system-on-a-chip capable of delivering an arithmetic
peak performance of 5.6 gigaflops. To match the memory
speed to the high compute performance, the system
implements an aggressive three-level on-chip cache
hierarchy. The implemented hierarchy offers high
bandwidth and integrated prefetching on cache hierarchy
levels 2 and 3 (L2 and L3) to reduce memory access
time. A Gigabit Ethernet interface driven by direct
memory access (DMA) is integrated in the cache
hierarchy, requiring only an external physical link
layer chip to connect to the media. The integrated L3
cache stores a total of 4 MB of data, using multibank
embedded dynamic random access memory (DRAM). The
1,024-bit-wide data port of the embedded DRAM provides
22.4 GB/s bandwidth to serve the speculative
prefetching demands of the two processor cores and the
Gigabit Ethernet DMA engine. To reduce hardware
overhead due to cache coherence intervention requests,
memory coherence is maintained by software. This is
particularly efficient for regular highly parallel
applications with partitionable working sets. The
system further integrates an on-chip double-data-rate
(DDR) DRAM controller for direct attachment of main
memory modules to optimize overall memory performance
and cost. For booting the system and low-latency
interprocessor communication and synchronization, a
16-KB static random access memory (SRAM) and hardware
locks have been added to the design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Adiga:2005:BGT,
author = "N. R. Adiga and M. A. Blumrich and D. Chen and P.
Coteus and A. Gara and M. E. Giampapa and P.
Heidelberger and S. Singh and B. D. Steinmacher-Burow
and T. Takken and M. Tsao and P. Vranas",
title = "{Blue Gene/L} torus interconnection network",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "265--276",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/adiga.pdf",
abstract = "The main interconnect of the massively parallel Blue
Gene/L is a three-dimensional torus network with
dynamic virtual cut-through routing. This paper
describes both the architecture and the
microarchitecture of the torus and a network
performance simulator. Both simulation results and
hardware measurements are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Bright:2005:BGC,
author = "A. A. Bright and R. A. Haring and M. B. Dombrowa and
M. Ohmacht and D. Hoenicke and S. Singh and J. A.
Marcella and R. F. Lembach and S. M. Douskey and M. R.
Ellavsky and C. G. Zoellin and A. Gara",
title = "{Blue Gene/L} compute chip: Synthesis, timing, and
physical design",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "277--287",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/bright.pdf",
abstract = "As one of the most highly integrated system-on-a-chip
application-specific integrated circuits (ASICs) to
date, the Blue Gene/L compute chip presented unique
challenges that required extensions of the standard
ASIC synthesis, timing, and physical design
methodologies. We describe the design flow from
floorplanning through synthesis and timing closure to
physical design, with emphasis on the novel features of
this ASIC. Among these are a process to easily inject
datapath placements for speed-critical circuits or to
relieve wire congestion, and a timing closure
methodology that resulted in timing closure for both
nominal and worst-case timing specifications. The
physical design methodology featured removal of the
pre-physical-design buffering to improve routability
and visualization of buses, and it featured strategic
seeding of buffers to close wiring and timing and end
up at 90\% utilization of total chip area. Robustness
was enhanced by using additional input/output (I/O) and
internal decoupling capacitors and by increasing
I/O-to-C4 wire widths.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Haring:2005:BGC,
author = "R. A. Haring and R. Bellofatto and A. A. Bright and P.
G. Crumley and M. B. Dombrowa and S. M. Douskey and M.
R. Ellavsky and B. Gopalsamy and D. Hoenicke and T. A.
Liebsch and J. A. Marcella and M. Ohmacht",
title = "{Blue Gene/L} compute chip: Control, test, and
bring-up infrastructure",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "289--301",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/haring.pdf",
abstract = "The Blue Gene/L compute (BLC) and Blue Gene/L link
(BLL) chips have extensive facilities for control,
bring-up, self-test, debug, and nonintrusive
performance monitoring built on a serial interface
compliant with IEEE Standard 1149.1. Both the BLL and
the BLC chips contain a standard eServer chip JTAG
controller called the access macro. For BLC, the
capabilities of the access macro were extended (1) to
accommodate the secondary JTAG controllers built into
embedded PowerPC cores; (2) to provide direct access to
memory for initial boot code load and for messaging
between the service node and the BLC chip; (3) to
provide nonintrusive access to device control
registers; and (4) to provide a suite of chip
configuration and control registers. The BLC clock tree
structure is described. It accommodates both functional
requirements and requirements for enabling multiple
built-in self-test domains, differentiated both by
frequency and functionality. The chip features a debug
port that allows observation of critical chip signals
at full speed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Wazlowski:2005:VSB,
author = "M. E. Wazlowski and N. R. Adiga and D. K. Beece and R.
Bellofatto and M. A. Blumrich and D. Chen and M. B.
Dombrowa and A. Gara and M. E. Giampapa and R. A.
Haring and P. Heidelberger and D. Hoenicke and B. J.
Nathanson and M. Ohmacht and R. Sharrar and S. Singh
and B. D. Steinmacher-Burow and R. B. Tremaine and M.
Tsao and A. R. Umamaheshwaran and P. Vranas",
title = "Verification strategy for the {Blue Gene/L} chip",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "303--318",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/wazlowski.pdf",
abstract = "The Blue Gene/L compute chip contains two PowerPC 440
processor cores, private L2 prefetch caches, a shared
L3 cache and double-data-rate synchronous dynamic
random access memory (DDR SDRAM) memory controller, a
collective network interface, a torus network
interface, a physical network interface, an interrupt
controller, and a bridge interface to slower devices.
System-on-a-chip verification problems require a
multilevel verification strategy in which the strengths
of each layer offset the weaknesses of another layer.
The verification strategy we adopted relies on the
combined strengths of random simulation, directed
simulation, and code-driven simulation at the unit and
system levels. The strengths and weaknesses of the
various techniques and our reasons for choosing them
are discussed. The verification platform is based on
event simulation and cycle simulation running on a farm
of Intel-processor-based machines, several
PowerPC-processor-based machines, and the internally
developed hardware accelerator Awan. The
cost/performance tradeoffs of the different platforms
are analyzed. The success of the first Blue Gene/L
nodes, which worked within days of receiving them and
had only a small number of undetected bugs (none
fatal), reflects both careful design and a
comprehensive verification strategy.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Giampapa:2005:BGA,
author = "M. E. Giampapa and R. Bellofatto and M. A. Blumrich
and D. Chen and M. B. Dombrowa and A. Gara and R. A.
Haring and P. Heidelberger and D. Hoenicke and G. V.
Kopcsay and B. J. Nathanson and B. D. Steinmacher-Burow
and M. Ohmacht and V. Salapura and P. Vranas",
title = "{Blue Gene/L} advanced diagnostics environment",
journal = j-IBM-JRD,
volume = "49",
number = "2/",
pages = "319--331",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/giampapa.pdf",
abstract = "This paper describes the Blue Gene/L advanced
diagnostics environment (ADE) used throughout all
aspects of the Blue Gene/L project, including design,
logic verification, bringup, diagnostics, and
manufacturing test. The Blue Gene/L ADE consists of a
lightweight multithreaded coherence-managed kernel,
runtime libraries, device drivers, system programming
interfaces, compilers, and host-based development
tools. It provides complete and flexible access to all
features of the Blue Gene/L hardware. Prior to the
existence of hardware, ADE was used on Very high-speed
integrated circuit Hardware Description Language (VHDL)
models, not only for logic verification, but also for
performance measurements, code-path analysis, and
evaluation of architectural tradeoffs. During early
hardware bring-up, the ability to run in a
cycle-reproducible manner on both hardware and VHDL
proved invaluable in fault isolation and analysis.
However, ADE is also capable of supporting
high-performance applications and parallel test cases,
thereby permitting us to stress the hardware to the
limits of its capabilities. This paper also provides
insights into system-level and device-level programming
of Blue Gene/L to assist developers of high-performance
applications to more fully exploit the performance of
the machine.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Iyer:2005:EDT,
author = "S. S. Iyer and J. E. {Barth, Jr.} and P. C. Parries
and J. P. Norum and J. P. Rice and L. R. Logan and D.
Hoyniak",
title = "Embedded {DRAM}: Technology platform for the {Blue
Gene/L} chip",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "333--350",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/iyer.pdf",
abstract = "The Blue Gene/L chip is a technological tour de force
that embodies the system-on-a-chip concept in its
entirety. This paper outlines the salient features of
this 130-nm complementary metal oxide semiconductor
(CMOS) technology, including the IBM unique embedded
dynamic random access memory (DRAM) technology. Crucial
to the execution of Blue Gene/L is the simultaneous
instantiation of multiple PowerPC cores,
high-performance static random access memory (SRAM),
DRAM, and several other logic design blocks on a
single-platform technology. The IBM embedded DRAM
platform allows this seamless integration without
compromising performance, reliability, or yield. We
discuss the process architecture, the key parameters of
the logic components used in the processor cores and
other logic design blocks, the SRAM features used in
the L2 cache, and the embedded DRAM that forms the L3
cache. We also discuss the evolution of embedded DRAM
technology into a higher-performance space in the 90-nm
and 65-nm nodes and the potential for dynamic memory to
improve overall memory subsystem performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Boyle:2005:OQQ,
author = "P. A. Boyle and D. Chen and N. H. Christ and M. A.
Clark and S. D. Cohen and C. Cristian and Z. Dong and
A. Gara and B. Jo{\'o} and C. Jung and C. Kim and L. A.
Levkova and X. Liao and R. D. Mawhinney and S. Ohta and
K. Petrov and T. Wettig and A. Yamaguchi",
title = "Overview of the {QCDSP} and {QCDOC} computers",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "351--365",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/boyle.pdf",
abstract = "The QCDSP and QCDOC computers are two generations of
multi-thousand-node multidimensional mesh-based
computers designed to study quantum chromodynamics
(QCD), the theory of the strong nuclear force. QCDSP
(QCD on digital signal processors), a four-dimensional
mesh machine, was completed in 1998; in that year, it
won the Gordon Bell Prize in the price/performance
category. Two large installations---of 8,192 and 12,288
nodes, with a combined peak speed of one
teraflops---have been in operation since. QCD-on-a-chip
(QCDOC) utilizes a six-dimensional mesh and compute
nodes fabricated with IBM system-on-a-chip technology.
It offers a tenfold improvement in price/performance.
Currently, 100-node versions are operating, and there
are plans to build three 12,288-node, 10-teraflops
machines. In this paper, we describe the architecture
of both the QCDSP and QCDOC machines, the operating
systems employed, the user software environment, and
the performance of our application---lattice QCD.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Moreira:2005:BGP,
author = "J. E. Moreira and G. Alm{\'a}si and C. Archer and R.
Bellofatto and P. Bergner and J. R. Brunheroto and M.
Brutman and J. G. Casta{\~n}os and P. G. Crumley and M.
Gupta and T. Inglett and D. Lieber and D. Limpert and
P. McCarthy and M. Megerian and M. Mendell and M. Mundy
and D. Reed and R. K. Sahoo and A. Sanomiya and R. Shok
and B. Smith and G. G. Stewart",
title = "{Blue Gene/L} programming and operating environment",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "367--376",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/moreira.pdf",
abstract = "With up to 65,536 compute nodes and a peak performance
of more than 360 teraflops, the Blue Gene/L (BG/L)
supercomputer represents a new level of massively
parallel systems. The system software stack for BG/L
creates a programming and operating environment that
harnesses the raw power of this architecture with great
effectiveness. The design and implementation of this
environment followed three major principles:
simplicity, performance, and familiarity. By
specializing the services provided by each component of
the system architecture, we were able to keep each one
simple and leverage the BG/L hardware features to
deliver high performance to applications. We also
implemented standard programming interfaces and
programming languages that greatly simplified the job
of porting applications to BG/L. The effectiveness of
our approach has been demonstrated by the operational
success of several prototype and production machines,
which have already been scaled to 16,384 nodes.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Chatterjee:2005:DEH,
author = "S. Chatterjee and L. R. Bachega and P. Bergner and K.
A. Dockser and J. A. Gunnels and M. Gupta and F. G.
Gustavson and C. A. Lapkowski and G. K. Liu and M.
Mendell and R. Nair and C. D. Wait and T. J. C. Ward
and P. Wu",
title = "Design and exploitation of a high-performance {SIMD}
floating-point unit for {Blue Gene/L}",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "377--391",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/chatterjee.pdf",
abstract = "We describe the design of a dual-issue
single-instruction, multiple-data-like (SIMD-like)
extension of the IBM PowerPC 440 floating-point unit
(FPU) core and the compiler and algorithmic techniques
to exploit it. This extended FPU is targeted at both
the IBM massively parallel Blue Gene/L machine and the
more pervasive embedded platforms. We discuss the
hardware and software codesign that was essential in
order to fully realize the performance benefits of the
FPU when constrained by the memory bandwidth
limitations and high penalties for misaligned data
access imposed by the memory hierarchy on a Blue Gene/L
node. Using both hand-optimized and compiled code for
key linear algebraic kernels, we validate the
architectural design choices, evaluate the success of
the compiler, and quantify the effectiveness of the
novel algorithm design techniques. Our measurements
show that the combination of algorithm, compiler, and
hardware delivers a significant fraction of peak
floating-point performance for compute-bound-kernels,
such as matrix multiplication, and delivers a
significant fraction of peak memory bandwidth for
memory-bound kernels, such as DAXPY, while remaining
largely insensitive to data alignment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Almasi:2005:DIM,
author = "G. Alm{\'a}si and C. Archer and J. G. Casta{\~n}os and
J. A. Gunnels and C. C. Erway and P. Heidelberger and
X. Martorell and J. E. Moreira and K. Pinnow and J.
Ratterman and B. D. Steinmacher-Burow and W. Gropp and
B. Toonen",
title = "Design and implementation of message-passing services
for the {Blue Gene/L} supercomputer",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "393--406",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/almasi.pdf",
abstract = "The Blue Gene/L (BG/L) supercomputer, with 65,536
dual-processor compute nodes, was designed from the
ground up to support efficient execution of massively
parallel message-passing programs. Part of this support
is an optimized implementation of the Message Passing
Interface (MPI), which leverages the hardware features
of BG/L. MPI for BG/L is implemented on top of a more
basic message-passing infrastructure called the message
layer. This message layer can be used both to implement
other higher-level libraries and directly by
applications. MPI and the message layer are used in the
two BG/L modes of operation: the coprocessor mode and
the virtual node mode. Performance measurements show
that our message-passing services deliver performance
close to the hardware limits of the machine. They also
show that dedicating one of the processors of a node to
communication functions (coprocessor mode) greatly
improves the message-passing bandwidth, whereas running
two processes per compute node (virtual node mode) can
have a positive impact on application performance.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Martorell:2005:BGP,
author = "X. Martorell and N. Smeds and R. Walkup and J. R.
Brunheroto and G. Alm{\'a}si and J. A. Gunnels and L.
DeRose and J. Labarta and F. Escal{\'e} and J.
Gim{\'e}nez and H. Servat and J. E. Moreira",
title = "{Blue Gene/L} performance tools",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "407--424",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/martorell.pdf",
abstract = "Good performance monitoring is the basis of modern
performance analysis tools for application
optimization. We are providing a variety of such
performance analysis tools for the new Blue Gene/L
supercomputer. Those tools can be divided into two
categories: single-node performance tools and multinode
performance tools. From a single-node perspective, we
provide standard interfaces and libraries, such as PAPI
and libHPM, that provide access to the hardware
performance counters for applications running on the
Blue Gene/L compute nodes. From a multinode
perspective, we focus on tools that analyze Message
Passing Interface (MPI) behavior. Those tools work by
first collecting message-passing trace data when a
program runs. The trace data is then used by graphical
interface tools that analyze the behavior of
applications. Using the current prototype tools, we
demonstrate their usefulness and applicability with
case studies of application optimization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Aridor:2005:RAU,
author = "Y. Aridor and T. Domany and O. Goldshmidt and J. E.
Moreira and E. Shmueli",
title = "Resource allocation and utilization in the {Blue
Gene/L} supercomputer",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "425--436",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/aridor.pdf",
abstract = "This paper describes partition allocation for parallel
jobs in the Blue Gene/L supercomputer. It describes the
novel network architecture of the Blue Gene/L (BG/L)
three-dimensional (3D) computational core and presents
a preliminary analysis of its properties and advantages
compared those of with more traditional systems. The
scalability challenge is solved in BG/L by sacrificing
granularity of system management. The system is treated
as a collection of composite allocation units that
contain both processing and communication resources. We
discuss the ensuing algorithmic framework for
computational and communication resource allocation and
present results of simulations that explore resource
utilization of BG/L for different workloads. We find
that utilization depends strongly on both the
predominant partition topology (mesh or torus) and the
3D shapes requested by the running jobs. When
communication links are treated as dedicated resources,
it is much more difficult to allocate toroidal
partitions than mesh ones, especially for jobs of more
than one allocation unit in each dimension. We show
that in these difficult cases, the advantage of BG/L
compared with a 3D toroidal machine of the same size is
very significant, with resource utilization better by a
factor of 2. In the easier cases (e.g., predominantly
mesh partitions), there are no disadvantages. The
advantage is primarily due to the BG/L novel
multi-toroidal topology that permits coallocation of
multiple toroidal partitions at negligible additional
cost.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Lorenz:2005:VTB,
author = "J. Lorenz and S. Kral and F. Franchetti and C. W.
Ueberhuber",
title = "Vectorization techniques for the {Blue Gene/L} double
{FPU}",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "437--446",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/lorenz.pdf",
abstract = "This paper presents vectorization techniques tailored
to meet the specifics of the two-way single-instruction
multiple-data (SIMD) double-precision floating-point
unit (FPU), which is a core element of the node
application-specific integrated circuit (ASIC) chips of
the IBM 360-teraflops Blue Gene/L supercomputer. This
paper focuses on the general-purpose basic-block
vectorization and optimization methods as they are
incorporated in the Vienna MAP vectorizer and
optimizer. The innovative technologies presented here,
which have consistently delivered superior performance
and portability across a wide range of platforms, were
carried over to prototypes of Blue Gene/L and joined
with the automatic performance-tuning system known as
Fastest Fourier Transform in the West (FFTW). FFTW
performance-optimization facilities working with the
compiler technologies presented in this paper are able
to produce vectorized fast Fourier transform (FFT)
codes that are tuned automatically to single Blue
Gene/L processors and are up to 80\% faster than the
best-performing scalar FFT codes generated by FFTW.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Germain:2005:EPD,
author = "R. S. Germain and Y. Zhestkov and M. Eleftheriou and
A. Rayshubskiy and F. Suits and T. J. C. Ward and B. G.
Fitch",
title = "Early performance data on the {Blue Matter} molecular
simulation framework",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "447--455",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/germain.pdf",
abstract = "Blue Matter is the application framework being
developed in conjunction with the scientific portion of
the IBM Blue Gene project. We describe the parallel
decomposition currently being used to target the Blue
Gene/L machine and discuss the application-based trace
tools used to analyze the performance of the
application. We also present the results of early
performance studies, including a comparison of the
performance of the Ewald and the particle-particle
particle-mesh (P3ME) methods, compare the measured
performance of some key collective operations with the
limitations imposed by the hardware, and discuss some
future directions for research.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Eleftheriou:2005:SFF,
author = "M. Eleftheriou and B. G. Fitch and A. Rayshubskiy and
T. J. C. Ward and R. S. Germain",
title = "Scalable framework for {$3$D} {FFTs} on the {Blue
Gene/L} supercomputer: Implementation and early
performance measurements",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "457--464",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/eleftheriou.pdf",
abstract = "This paper presents results on a
communications-intensive kernel, the three-dimensional
fast Fourier transform (3D FFT), running on the
2,048-node Blue Gene/L (BG/L) prototype. Two
implementations of the volumetric FFT algorithm were
characterized, one built on the Message Passing
Interface library and another built on an active packet
Application Program Interface supported by the hardware
bring-up environment, the BG/L advanced diagnostics
environment. Preliminary performance experiments on the
BG/L prototype indicate that both of our
implementations scale well up to 1,024 nodes for $3$D
FFTs of size $128 \time 128 \times 128$. The
performance of the volumetric FFT is also compared with
that of the Fastest Fourier Transform in the West
(FFTW) library. In general, the volumetric FFT
outperforms a port of the FFTW Version 2.1.5 library on
large-node-count partitions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Enenkel:2005:CMF,
author = "R. F. Enenkel and B. G. Fitch and R. S. Germain and F.
G. Gustavson and A. Martin and M. Mendell and J. W.
Pitera and M. C. Pitman and A. Rayshubskiy and F. Suits
and W. C. Swope and T. J. C. Ward",
title = "Custom math functions for molecular dynamics",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "465--474",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/enenkel.pdf",
abstract = "While developing the protein folding application for
the IBM Blue Gene/L supercomputer, some frequently
executed computational kernels were encountered. These
were significantly more complex than the linear algebra
kernels that are normally provided as tuned libraries
with modern machines. Using regular library functions
for these would have resulted in an application that
exploited only 5--10\% of the potential floating-point
throughput of the machine. This paper is a tour of the
functions encountered; they have been expressed in C++
(and could be expressed in other languages such as
Fortran or C). With the help of a good optimizing
compiler, floating-point efficiency is much closer to
100\%. The protein folding application was initially
run by the life science researchers on IBM POWER3e
machines while the computer science researchers were
designing and bringing up the Blue Gene/L hardware.
Some of the work discussed resulted in enhanced
compiler optimizations, which now improve the
performance of floating-point-intensive applications
compiled by the IBM VisualAgent series of compilers for
POWER3, POWER4e, POWER4+, and POWER5. The
implementations are offered in the hope that they may
help in other implementations of molecular dynamics or
in other fields of endeavor, and in the hope that
others may adapt the ideas presented here to deliver
additional mathematical functions at high throughput.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Suits:2005:OMD,
author = "F. Suits and M. C. Pitman and J. W. Pitera and W. C.
Swope and R. S. Germain",
title = "Overview of molecular dynamics techniques and early
scientific results from the {Blue Gene} project",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "475--487",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/suits.pdf",
abstract = "The Blue Gene project involves the development of a
highly parallel supercomputer, the coding of scalable
applications to run on it, and the design of protein
simulations that take advantage of the power provided
by the new machine. This paper provides an overview of
analysis techniques applied to scientific results
obtained with Blue Matter, the software framework for
performing molecular dynamics simulations on the Blue
Gene/L computer. Blue Matter is a portable environment
that runs on several platforms ranging from
single-processor to massively parallel machines. Since
the Blue Gene/L computer has become available only
recently, this work describes analysis techniques
applied to a range of experiments of increasing
complexity on a corresponding range of machine sizes,
concluding with a membrane protein simulation currently
running on a 512-node Blue Gene/L computer.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Bhanot:2005:OTL,
author = "G. Bhanot and A. Gara and P. Heidelberger and E.
Lawless and J. C. Sexton and R. Walkup",
title = "Optimizing task layout on the {Blue Gene/L}
supercomputer",
journal = j-IBM-JRD,
volume = "49",
number = "2/3",
pages = "489--500",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 1 08:14:41 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/492/bhanot.pdf",
abstract = "A general method for optimizing problem layout on the
Blue Gene/L (BG/L) supercomputer is described. The
method takes as input the communication matrix of an
arbitrary problem as an array with entries $C(i, j)$,
which represents the data communicated from domain $i$
to domain $j$. Given $C(i, j)$, we implement a
heuristic map that attempts to sequentially map a
domain and its communication neighbors either to the
same BG/L node or to near-neighbor nodes on the BG/L
torus, while keeping the number of domains mapped to a
BG/L node constant. We then generate a Markov chain of
maps using Monte Carlo simulation with free energy $F =
\sum_{i,j} C(i, j)H(i, j)$, where $H(i, j)$ is the
smallest number of hops on the BG/L torus between
domain $i$ and domain $j$. For two large parallel
applications, SAGE and UMT2000, the method was tested
against the default Message Passing Interface rank
order layout on up to 2,048 BG/L nodes. It produced
maps that improved communication efficiency by up to
45\%.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0240",
}
@Article{Tendler:2005:P,
author = "Joel M. Tendler",
title = "Preface",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "503--504",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sinharoy:2005:PSM,
author = "B. Sinharoy and R. N. Kalla and J. M. Tendler and R.
J. Eickemeyer and J. B. Joyner",
title = "{POWER5} system microarchitecture",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "505--521",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/sinharoy.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Armstrong:2005:AVC,
author = "W. J. Armstrong and R. L. Arndt and D. C. Boutcher and
R. G. Kovacs and D. Larson and K. A. Lucke and N. Nayar
and R. C. Swanberg",
title = "Advanced virtualization capabilities of {POWER5}
systems",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "523--532",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/armstrong.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mackerras:2005:OSE,
author = "P. Mackerras and T. S. Mathews and R. C. Swanberg",
title = "Operating system exploitation of the {POWER5} system",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "533--539",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/mackerras.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Victor:2005:FVP,
author = "D. W. Victor and J. M. Ludden and R. D. Peterson and
B. S. Nelson and W. K. Sharp and J. K. Hsu and B.-L.
Chu and M. L. Behm and R. M. Gott and A. D. Romonosky
and S. R. Farago",
title = "Functional verification of the {POWER5} microprocessor
and {POWER5} multiprocessor systems",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "541--553",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/victor.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mathis:2005:CSM,
author = "H. M. Mathis and A. E. Mericas and J. D. McCalpin and
R. J. Eickemeyer and S. R. Kunkel",
title = "Characterization of simultaneous multithreading
({SMT}) efficiency in {POWER5}",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "555--564",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See erratum \cite{Anonymous:2005:ECS}.",
URL = "http://www.research.ibm.com/journal/rd/494/mathis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gott:2005:FFV,
author = "R. M. Gott and J. R. Baumgartner and P. Roessler and
S. I. Joe",
title = "Functional formal verification on designs of {pSeries}
microprocessors and communication subsystems",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "565--580",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/gott.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Goldman:2005:UMF,
author = "S. P. Goldman and L. M. Mohr and D. R. Smith",
title = "Using microcode in the functional verification of an
{I/O} chip",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "581--588",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/goldman.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kahle:2005:ICM,
author = "J. A. Kahle and M. N. Day and H. P. Hofstee and C. R.
Johns and T. R. Maeurer and D. Shippy",
title = "Introduction to the {Cell} multiprocessor",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "589--604",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/kahle.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Frase:2005:P,
author = "Katharine G. Frase and David E. Seeger",
title = "Preface",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "605--606",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/preface2.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kang:2005:MMP,
author = "S. K. Kang and P. A. Lauro and D.-Y. Shih and D. W.
Henderson and K. J. Puttlitz",
title = "Microstructure and mechanical properties of lead-free
solders and solder joints used in microelectronic
applications",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "607--620",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/kang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gruber:2005:LCW,
author = "P. A. Gruber and L. B{\'e}langer and G. P. Brouillette
and D. H. Danovitch and J.-L. Landreville and D. T.
Naugle and V. A. Oberson and D.-Y. Shih and C. L.
Tessler and M. R. Turgeon",
title = "Low-cost wafer bumping",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "621--639",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/gruber.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Blackshear:2005:EBP,
author = "E. D. Blackshear and M. Cases and E. Klink and S. R.
Engle and R. S. Malfatt and D. N. de Araujo and S.
Oggioni and L. D. Lacroix and J. A. Wakil and N. H.
Pham and G. G. Hougham and D. J. Russell",
title = "The evolution of build-up package technology and its
design challenges",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "641--661",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/blackshear.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buchwalter:2005:EMS,
author = "S. L. Buchwalter and P. J. Brofman and C. Feger and M.
A. Gaynes and K.-W. Lee and L. J. Matienzo and D. L.
Questad",
title = "Effects of mechanical stress and moisture on packaging
interfaces",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "663--675",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/buchwalter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yarmchuk:2005:LDS,
author = "E. J. Yarmchuk and C. W. Cline and D. C. Bruen",
title = "Latent defect screening for high-reliability
glass-ceramic multichip module copper interconnects",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "677--685",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/yarmchuk.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Manzer:2005:HSE,
author = "D. G. Manzer and J. P. Karidis and K. M. Wiley and D.
C. Bruen and C. W. Cline and C. Hendricks and R. N.
Wiggin and Y.-Y. Yu",
title = "High-speed electrical testing of multichip ceramic
modules",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "687--697",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/manzer.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Feger:2005:MRS,
author = "C. Feger and J. D. Gelorme and M. McGlashan-Powell and
D. M. Kalyon",
title = "Mixing, rheology, and stability of highly filled
thermal pastes",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "699--707",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/feger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schmidt:2005:CDC,
author = "R. R. Schmidt and E. E. Cruz and M. K. Iyengar",
title = "Challenges of data center thermal management",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "709--723",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/schmidt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Knickerbocker:2005:DNG,
author = "J. U. Knickerbocker and P. S. Andry and L. P.
Buchwalter and A. Deutsch and R. R. Horton and K. A.
Jenkins and Y. H. Kwark and G. McVicker and C. S. Patel
and R. J. Polastre and C. Schuster and A. Sharma and S.
M. Sri-Jayantha and C. W. Surovic and C. K. Tsang and
B. C. Webb and S. L. Wright and S. R. McKnight and E.
J. Sprogis and B. Dang",
title = "Development of next-generation system-on-package
({SOP}) technology based on silicon carriers with
fine-pitch chip interconnection",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "725--753",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/knickerbocker.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Benner:2005:EOI,
author = "A. F. Benner and M. Ignatowski and J. A. Kash and D.
M. Kuchta and M. B. Ritter",
title = "Exploitation of optical interconnects in future server
architectures",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "755--775",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/benner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lanzerotti:2005:MPI,
author = "M. Y. Lanzerotti and G. Fiorenza and R. A. Rand",
title = "Microminiature packaging and integrated circuitry: The
work of {E. F. Rent}, with an application to on-chip
interconnection requirements",
journal = j-IBM-JRD,
volume = "49",
number = "4/5",
pages = "777--803",
month = "????",
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 5 07:12:31 MDT 2005",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/494/lanzerotti.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bradicich:2005:P,
author = "T. M. Bradicich",
title = "Preface",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "807--??",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Desai:2005:BSO,
author = "D. M. Desai and T. M. Bradicich and D. Champion and W.
G. Holland and B. M. Kreuz",
title = "{BladeCenter} system overview",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "809--821",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/desai.html",
abstract = "The IBM eServer BladeCenter system was conceived in
the fall of 1999 by members of the IBM xSeries server
brand technical team (at the time, called the Netfinity
brand). It was a new idea, and for some, too
revolutionary to consider. After considerable end-user
feedback, technical refinement, and internal discussion
and debate, the concept was developed into a leadership
server product. This paper provides a brief historic
overview of the development of the architecture and
blade servers, and a technical description of the
BladeCenter system and technology.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Hughes:2005:BMM,
author = "J. E. Hughes and P. S. Patel and I. R. Zapata and T.
D. {Pahel, Jr.} and J. P. Wong and D. M. Desai and B.
D. Herrman",
title = "{BladeCenter} midplane and media interface card",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "823--836",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/patel.html",
abstract = "This paper describes the electrical architecture and
design of the IBM eServer BladeCenter midplane and
media interface card. The midplane provides the
redundant interconnects among processor blades, switch
modules, media interface card, and management modules.
It also serves as the redundant power distribution
medium from the power modules to all blades and other
devices. A major attribute of the BladeCenter
electrical design is the redundant nature of the
interconnects, which gives this product superior
reliability and availability. The media interface card
provides the interface between the CD-ROM and floppy
disk drives and the blades that share these devices.
The sharing of these devices was a key BladeCenter
innovation. Also, to ensure that the architecture will
be flexible enough to support multiple input/output
fabric protocols, SerDes (serialized/deserialized) is
used as the internal high-speed communication
electrical interface. Since high- speed designs can
easily result in higher implementation costs, a
significant predesign simulation effort was undertaken
to analyze and prioritize design guidelines in order to
develop a high-speed midplane at a competitive cost.
This paper highlights how we reduced board costs by
finding solutions that overcame some of the challenges
of 2.5-Gb/s data transmission over multiple printed
circuit boards and connectors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Hughes:2005:BPB,
author = "J. E. Hughes and M. L. Scollard and R. Land and J.
Parsonese and C. C. West and V. A. Stankevich and C. L.
Purrington and D. Q. Hoang and G. R. Shippy and M. L.
Loeb and M. W. Williams and B. A. Smith and D. M.
Desai",
title = "{BladeCenter} processor blades, {I/O} expansion
adapters, and units",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "837--859",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/hughes.html",
abstract = "This paper describes the electrical architecture and
design of the IBM eServer BladeCenter processor blades,
expansion blades, and input/output (I/O) expansion
adapters and units. The processor blades are
independent, general-purpose servers containing
processors, chipsets, main memory, hard drives, network
interface controllers, power input control circuitry,
and local systems management. The blade architecture is
robust and flexible enough to enable the design of
general-purpose Intel- processor-based two-way and
four-way blades, IBM POWER-processor-based blades,
blades based on AMD Opteron processors, and common
expansion blades. In addition, the processor blades,
expansion adapters, and units use a serialized\slash
deserialized (SerDes) interface for the internal I/O
fabrics, thus giving blades the flexibility to support
virtually any I/O protocol that supports SerDes.
Support for I/O fabrics beyond the base Gigabit
Ethernet is accomplished via optional I/O expansion
adapters for Fibre Channel, Myricom Myrinet t,
InfiniBand t, or additional Gigabit Ethernet.
Additional storage or peripheral component interface
capability can be added to the processor blades via
expansion blades.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Fore:2005:BS,
author = "L. S. Fore and D. W. Cosby and G. Pruett and D. B.
Rhoades and C. O. Schulz and B. Smith and J. L.
Wooldridge",
title = "{BladeCenter} solutions",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "861--871",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/fore.html",
abstract = "The architecture and design of the IBM eServer
BladeCenter system make it an ideal platform for many
information technology (IT) solutions. Its high
availability, modularity, flexible infrastructure
integration, and on demand configuration options have
prompted developers within IBM and in end-user IT
organizations to create solutions tailored to a
particular industry or function. This paper describes
the BladeCenter system in the application of several of
these solutions--their target enterprises, end-users,
and key benefits. High-performance and scientific
clusters, branch-office-in-a-box, financial services,
and hosted- client solutions are reviewed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Vanderlinden:2005:BST,
author = "S. L. Vanderlinden and B. O. Anthony and G. D.
Batalden and B. K. Gorti and J. Lloyd and J. {Macon,
Jr.} and G. Pruett and B. A. Smith",
title = "{BladeCenter T} system for the telecommunications
industry",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "873--886",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/vanderlinden.html",
abstract = "This paper describes the IBM eServer BladeCenter T
system, an extension of the BladeCenter platform
designed for the specific and rigorous requirements of
the telecommunications industry, such as compliance
with Telcordia Technologies Network Equipment\slash
Building Standards (NEBSe) specifications. The
Telcordia NEBS documents and the analogous documents
written for the European marketplace by the European
Telecommunications Standards Institute define the range
of environmental and electrical parameters presented by
this market segment. A key characteristic of the
telecommunications industry is its focus on the
availability and redundancy of the equipment used to
provide service to its customers. These requirements
imposed significant design changes on the BladeCenter
platform and software, while maintaining a solution
compatible with the original BladeCenter architecture.
This paper provides details of the design changes that
were made in the areas of hardware, software, systems
management, and integration, and concludes with
examples and a discussion of customer solutions with
the BladeCenter T system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Crippen:2005:BPP,
author = "M. J. Crippen and R. K. Alo and D. Champion and R. M.
Clemo and C. M. Grosser and N. J. Gruendler and M. S.
Mansuria and J. A. Matteson and M. S. Miller and B. A.
Trumbo",
title = "{BladeCenter} packaging, power, and cooling",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "887--904",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/crippen.html",
abstract = "This paper addresses the packaging, power, and cooling
of the IBM eServer BladeCenter compact server
infrastructure consisting of 14 servers in a 7U
(1U\slash 44.45 mm) vertical space for installation in
an industry-standard rack. A typical rack is 42U tall.
Therefore, six BladeCenter systems will fit in a rack,
for a total of 84 servers. The density of a {BladeCenter}
system (servers/ U) is double that of previous 1U
rack-optimized servers. To build such a dense server
system required overcoming a multitude of challenges in
packaging, power, and cooling design. Our approach to
these challenges is described, but in the broader
context of not only increasing the density, but setting
a new server standard for a highly available redundant
infrastructure with integrated systems management and
network switching that uses less power and is simple to
maintain on site or remotely, even by nonspecialized
personnel. Server processors, memory, storage, and
input/output devices were combined in a single compact
server unit called a processor blade, while the support
infrastructure, such as systems management, network
connectivity, optical media, power, and cooling, was
consolidated in a single structure and shared among
many servers. The result is a package architecture that
lends itself well to standardization. Custom server
blades and input/output devices may be designed in
accordance with BladeCenter base specifications and be
effectively integrated into the blade server system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Hunter:2005:BN,
author = "S. W. Hunter and N. C. Strole and D. W. Cosby and D.
M. Green",
title = "{BladeCenter} networking",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "905--919",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/hunter.html",
abstract = "The IBM eServer BladeCenter system physically
consolidates the server and network into a common
chassis. It was introduced as a new server architecture
that provides many benefits over the traditional data
center model of clustered independent systems linked by
a network fabric. This paper describes the BladeCenter
networking architecture and relates it to user
requirements for multi-tier servers, scale-out models,
networking technology advances, and industry trends.
Design decisions and challenges, the switch subsystem
and input/output technology options, services that are
currently supported by the architecture, and future
enhancements and extensions are addressed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Holland:2005:BS,
author = "W. G. Holland and P. L. Caporale and D. S. Keener and
A. B. McNeill and T. B. Vojnovich",
title = "{BladeCenter} storage",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "921--939",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/holland.html",
abstract = "This paper describes the available storage options for
the IBM eServer BladeCenter system---local hard disk
drives on each processor blade, network-attached
storage accessed over Ethernet, and storage area
network (SAN)-attached storage accessed over Fibre
Channel---highlighting where each provides a compelling
or unique storage solution. The basic selection
criteria are presented, focusing on the most
significant attributes of each option. Additional
information is provided for emerging technologies,
iSCSI (SAN-attached storage accessed over Ethernet) and
InfiniBand, and the technologies and attributes that
have unique importance in a blade-server environment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Brey:2005:BCM,
author = "T. Brey and B. E. Bigelow and J. E. Bolan and H.
Cheselka and Z. Dayar and J. M. Franke and D. E.
Johnson and R. N. Kantesaria and E. J. Klodnicki and S.
Kochar and S. M. Lardinois and C. A. Morrell and M. S.
Rollins and R. R. Wolford and D. R. Woodham",
title = "{BladeCenter} chassis management",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "941--961",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/brey.html",
abstract = "The IBM eServer BladeCenter system allows compute,
network, and storage components to operate under a
common chassis management scheme. It offers a new
approach to solving many systems management issues
surrounding the integration of power, packaging,
cooling, media peripherals, and cabling of multiple
compute servers, network switches, and storage into one
highly redundant package. In the BladeCenter design,
these functions are integrated into the chassis,
allowing the costs of each shared component to be
amortized across the entire chassis. At the heart of
the system is the management module hardware and
firmware that provides chassis management for all
components, thereby removing the cost and complexity of
having to manage each component independently.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Pruett:2005:BSM,
author = "G. Pruett and A. Abbondanzio and J. Bielski and T. D.
Fadale and A. E. Merkin and Z. Rafalovich and L. A.
Riedle and J. W. Simpson",
title = "{BladeCenter} systems management software",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "963--975",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/pruett.html",
abstract = "The management software for the IBM eServer
BladeCenter platform combines multiple management tools
and technologies to create an integrated solution for
managing, configuring, and deploying the chassis
components and attached storage area networks. The IBM
software also integrates BladeCenter platform
management capabilities with other enterprise system
management tools. This paper describes the architecture
and capabilities of the IBM Director, Cluster Systems
Manager, and Virtualization Enginee tools, which enable
customers to configure, manage, and provision the
BladeCenter system. These tools configure and monitor
the chassis using out-of-band communications with the
BladeCenter management module. Management agents
installed on each processor blade provide in-band
operating system monitoring and integration into
enterprise management applications, such as IBM Tivoli
software. This paper includes a description of the
management technologies and design innovations that
assist the system administrator with management tasks
such as discovery, blade and switch module
configuration, asset inventory, out-of- band control,
alerting and event actions, storage configuration,
operating system installation, application deployment,
and provisioning.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Piazza:2005:BTD,
author = "W. J. Piazza and R. E. Harper and M. J. Crippen and J.
A. Matteson",
title = "{BladeCenter} thermal diagnostics",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "977--987",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/piazza.html",
abstract = "An analytical technique called thermal diagnostics is
presented as a tool for determining the root cause of
thermal anomalies arising in electronic equipment. The
technique utilizes a dynamically constructed flow
network model, real-time inventory, temperature,
utilization metrics, and statistical hypothesis testing
to select the most likely scenario from among thousands
of potential causes of thermal problems. This paper
describes the concept of thermal diagnostics and
concludes with results from a laboratory evaluation in
which we physically trigger thermal anomalies on a
running IBM eServer BladeCenter system and record the
diagnosis given by the algorithm. In these tests, our
algorithm correctly diagnosed the thermal situation and
provided meaningful guidance toward clearing the
detected problems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Anonymous:2005:AIV,
author = "Anonymous",
title = "Author index for Volume 49",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "989--998",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/authv49.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Anonymous:2005:SIV,
author = "Anonymous",
title = "Subject index for Volume 49",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "999--1003",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/subjv49.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Anonymous:2005:ECS,
author = "Anonymous",
title = "Errata: {{\em Characterization of Simultaneous
Multithreading (SMT) Efficiency in POWER5}}",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "1003--1003",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Mathis:2005:CSM}.",
URL = "http://www.research.ibm.com/journal/rd/496/errata.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Balog:2005:MVP,
author = "Douglas Balog",
title = "Message from the {Vice President, BladeCenter
Development, IBM Systems and Technology Group}",
journal = j-IBM-JRD,
volume = "49",
number = "6",
pages = "??--??",
month = nov,
year = "2005",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 21:39:23 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/496/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0245-00",
}
@Article{Gallagher:2006:P,
author = "W. J. Gallagher and S. S. P. Parkins",
title = "Preface",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "3--4",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Gallagher:2006:DMT,
author = "W. J. Gallagher and S. S. P. Parkin",
title = "Development of the magnetic tunnel junction {MRAM} at
{IBM}: From first junctions to a {16-Mb MRAM}
demonstrator chip",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "5--24",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See erratum \cite{Anonymous:2006:EDM}.",
URL = "http://www.research.ibm.com/journal/rd/501/gallagher.html",
abstract = "This paper reviews the remarkable developments of the
magnetic tunnel junction over the last decade and in
particular, work aimed at demonstrating its potential
for a dense, fast, and nonvolatile random access
memory. The initial focus is on the technological roots
of the magnetic tunnel junction, and then on the recent
progress made with engineered materials for this
device. Following that, we discuss the development of
the magnetic random access memory (MRAM) technology, in
which the magnetic tunnel junction serves as both the
storage device and the storage sensing device. The
emphasis is on work at IBM, including demonstrations of
basic capabilities of the technology and work on a
16-Mb ``product demonstrator'' design in 180-nm node
technology, which was targeted to be a realistic test
bed for the MRAM technology. Performance and cost are
compared with those of competing technologies. The
paper also serves as an introduction to more
specialized papers in this issue on MRAM device
physics, magnetic tunnel junction materials and device
characterization, MRAM processing, and MRAM design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Maffitt:2006:DCM,
author = "T. M. Maffitt and J. K. DeBrosse and J. A. Gabric and
E. T. Gow and M. C. Lamorey and J. S. Parenteau and D.
R. Willmott and M. A. Wood and W. J. Gallagher",
title = "Design considerations for {MRAM}",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "25--39",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/maffitt.html",
abstract = "MRAM (magnetic random access memory) technology, based
on the use of magnetic tunnel junctions (MTJs) as
memory elements, is a potentially fast nonvolatile
memory technology with very high write endurance. This
paper is an overview of MRAM design considerations.
Topics covered include MRAM fundamentals, array
architecture, several associated design studies, and
scaling challenges. In addition, a 16-Mb MRAM
demonstration vehicle is described, and performance
results are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Gaidis:2006:TLB,
author = "M. C. Gaidis and E. J. O'Sullivan and J. J. Nowak and
Y. Lu and S. Kanakasabapathy and P. L. Trouilloud and
D. C. Worledge and S. Assefa and K. R. Milkove and G.
P. Wright and W. J. Gallagher",
title = "Two-level {BEOL} processing for rapid iteration in
{MRAM} development",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "41--54",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/gaidis.html",
abstract = "The implementation of magnetic random access memory
(MRAM) hinges on complex magnetic film stacks and
several critical steps in back-end-of-line (BEOL)
processing. Although intended for use in conjunction
with silicon CMOS front-end device drivers, MRAM
performance is not limited by CMOS technology. We
report here on a novel test site design and an
associated thin-film process integration scheme which
permit relatively inexpensive, rapid characterization
of the critical elements in MRAM device fabrication.
The test site design incorporates circuitry consistent
with the use of a large-area planar base electrode to
enable a processing scheme with only two photomask
levels. The thin-film process integration scheme is a
modification of standard BEOL processing to accommodate
temperature-sensitive magnetic tunnel junctions (MTJs)
and poor-shear-strength magnetic film interfaces.
Completed test site wafers are testable with high-speed
probing techniques, permitting characterization of
large numbers of MTJs for statistically significant
analyses. The approach described in this paper provides
an inexpensive means for rapidly iterating on MRAM
development alternatives to converage on an
implementation suitable for a production environment.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Abraham:2006:RTC,
author = "D. W. Abraham and P. L. Trouilloud and D. C.
Worledge",
title = "Rapid-turnaround characterization methods for {MRAM}
development",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "55--67",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/abraham.html",
abstract = "Magnetic random access memory (MRAM) technology, based
on the use of magnetic tunnel junctions (MTJs), holds
the promise of improving on the capabilities of
existing charge-based memories by offering the
combination of nonvolatility, speed, and density in a
single technology. In this paper we review
rapid-turnaround methods which have been developed or
applied in new ways to characterize MRAM chips at
various stages during processing, with particular
emphasis on the MTJs. The methods include
current-in-plane tunneling (CIPT), Kerr magnetometry,
vibrating sample magnetometry (VSM), and conducting
atomic force microscopy (CAFM). Use of the methods has
enabled rapid learning with respect to the materials
used for the MTJs, as well as tuning of the MTJ
geometry in terms of size and shape and of the
patterning methods employed. Examples of the use of
each of the methods are presented along with
interpretation of the data via critical operating
parameters.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Worledge:2006:SDM,
author = "D. C. Worledge",
title = "Single-domain model for toggle {MRAM}",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "69--79",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/worledge.html",
abstract = "An overview is presented of the use of a single-domain
model for developing an understanding of the switching
of two coupled magnetic free layers for toggle MRAM
(magnetic random access memory). The model includes the
effects of length, width, thickness, magnetization,
thickness asymmetry, intrinsic anisotropy, exchange
coupling, dipole coupling, and applied magnetic field.
First, a simple perturbative approach is used to
understand the basic phenomena at low fields, including
the critical switching curve and activation energy.
Then the more general model is applied in order to
understand the effects of saturation at large field,
and thickness asymmetry. The major results are that
toggle MRAM should have a larger margin for half-select
and full- select switching fields than Stoner\slash
Wohlfarth MRAM, and that the activation energy should
increase upon half-select, thus eliminating the
half-select activated-error problem.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Sun:2006:SAM,
author = "J. Z. Sun",
title = "Spin angular momentum transfer in
current-perpendicular nanomagnetic junctions",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "81--100",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/sun.html",
abstract = "Spin angular momentum transfer, or spin-transfer,
describes the transfer of spin angular momentum between
a spin-polarized current and a ferromagnetic conductor.
The angular momentum transfer exerts a torque
(spin-current induced torque, or spin- torque) on the
ferromagnetic conductor. When its dimensions are
reduced to less than 100 nm, the spin-torque can become
comparable to the magnetic damping torque at a
spin-polarized current of high current density (above
106 A/cm2), giving rise to a new set of current-induced
dynamic excitation and magnetic switching phenomena.
This has now been definitively observed in sub-100-nm
current-perpendicular spin-valves and magnetic tunnel
junctions, and appears promising as a basis for direct
write-address of a nanomagnetic bit when the lateral
bit size is reduced to well below 100 nm. An overview
is presented in this paper of spin- transfer phenomena.
The first part of the paper contains a brief
introduction to spin-transfer, especially the
characteristic dynamics associated with spin-torque. In
the second part, several representative experiments are
described. In the third part, a set of basic
phenomenological models are introduced that describe
experimental observations. The models also serve as a
bridge for quantitative comparison between experiments
and first-principles spin-polarized transport theory.
In the last part of the paper, some device concepts
based on spin-transfer-induced magnetic excitation and
magnetic reversal are described.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Wolf:2006:SRP,
author = "S. A. Wolf and A. Y. Chtchelkanova and D. M. Treger",
title = "Spintronics---{A} retrospective and perspective",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "101--110",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/wolf.html",
abstract = "Spintronics is a rapidly emerging field of science and
technology that will most likely have a significant
impact on the future of all aspects of electronics as
we continue to move into the 21st century. Conventional
electronics are based on the charge of the electron.
Attempts to use the other fundamental property of an
electron, its spin, have given rise to a new, rapidly
evolving field, known as spintronics, an acronym for
spin transport electronics that was first introduced in
1996 to designate a program of the U.S. Defense
Advanced Research Projects Agency (DARPA). Initially,
the spintronics program involved overseeing the
development of advanced magnetic memory and sensors
based on spin transport electronics. It was then
expanded to included Spins IN Semiconductors (SPINS),
in the hope of developing a new paradigm in
semiconductor electronics based on the spin degree of
freedom of the electron. Studies of spin-polarized
transport in bulk and low-dimensional semiconductor
structures show promise for the creation of a hybrid
device that would combine magnetic storage with
gain--in effect, a spin memory transistor. This paper
reviews some of the major developments in this field
and provides a perspective of what we think will be the
future of this exciting field. It is not meant to be a
comprehensive review of the whole field but reflects a
bias on the part of the authors toward areas that they
believe will lead to significant future technologies.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Jiang:2006:HER,
author = "X. Jiang and R. Wang and R. M. Shelby and S. S. P.
Parkin",
title = "Highly efficient room-temperature tunnel spin injector
using {CoFe\slash MgO(001)}",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "111--120",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/jiang.html",
abstract = "Semiconductor spintronics is a promising technology in
which the spin states of electrons are utilized as an
additional degree of freedom for device operation. One
of its prerequisites is the ability to inject
spin-polarized electrons into semiconductors. An
overview is presented of recent progress in spin
injection using an injector based on a crystalline
CoFe/MgO(001) tunnel structure. The spin polarization
of the electrons that were injected into a GaAs
quantum-well light-emitting diode was inferred from
electroluminescence polarization from the quantum well.
Spin polarizations of 57\% at 100 K and 47\% at room
temperature were obtained. The spin polarization was
found to exhibit a strong dependence on bias and
temperature, which can be explained on the basis of
spin relaxation within the GaAs.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Zutic:2006:BSF,
author = "I. {\v{Z}}uti{\'c} and J. Fabian and S. C. Erwin",
title = "Bipolar spintronics: Fundamentals and applications",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "121--139",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/zutic.html",
abstract = "By incorporating spin-dependent properties and
magnetism in semiconductor structures, new applications
can be considered which go beyond magnetoresistive
effects in metallic systems. Notwithstanding the
prospects for spin/magnetism-enhanced logic in
semiconductors, many important theoretical,
experimental, and materials challenges remain. Here we
discuss the challenges for realizing a particular class
of associated applications and our proposal for bipolar
spintronic devices in which carriers of both polarities
(electrons and holes) would contribute to spin-charge
coupling. We formulate the theoretical framework for
bipolar spin- polarized transport and describe several
novel effects in two- and three-terminal structures
which arise from the interplay between nonequilibrium
spin and equilibrium magnetization.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Bernevig:2006:TDS,
author = "B. A. Bernevig and S. Zhang",
title = "Toward dissipationless spin transport in
semiconductors",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "141--148",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/bernevig.html",
abstract = "Spin-based electronics promises a radical alternative
to charge- based electronics, namely the possibility of
logic operations with much lower power consumption than
equivalent charge-based logic operations. In this paper
we review three potential means of dissipationless spin
transport in semiconductors with and without spin-orbit
coupling: the use of spin currents, propagating modes,
and orbital currents. Spin and orbital currents induced
by electric fields obey a fundamentally different law
than charge transport, which is dissipative.
Dissipationless spin currents occur in materials with
strong spin-orbit coupling, such as GaAs, while orbital
currents occur in materials with weak spin-orbit
coupling, such as Si, but with degenerate bands
characterized by an atomic orbital index. Spin currents
have recently been observed experimentally. Propagating
modes are the coupled spin-charge movement that occurs
in semiconductors with spin-orbit coupling. In contrast
to normal charge transport, which is diffusive, the
spin-charge mode can exhibit propagating transport,
with low energy loss over relatively large distances
(.100 lm), by funneling energy between the spin and the
charge component through the spin-orbit coupling
channel. This opens the possibility for spin-based
transport without either spin injection or spin
detection. The schemes discussed in this paper are
analyzed in comparison with schemes based on molecular
electronics phenomena, dilute magnetic semiconductors,
etc.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Agarwal:2006:AGA,
author = "R. C. Agarwal and K. Gupta and S. Jain and S.
Amalapurapu",
title = "An approximation to the greedy algorithm for
differential compression",
journal = j-IBM-JRD,
volume = "50",
number = "1",
pages = "149--166",
month = jan,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/501/agarwal.html",
abstract = "We present a new differential compression algorithm
that combines the hash value techniques and suffix
array techniques of previous work. The term
``differential compression'' refers to encoding a file
(a version file) as a set of changes with respect to
another file (a reference file). Previous differential
compression algorithms can be shown empirically to run
in linear time, but they have certain drawbacks;
namely, they do not find the best matches for every
offset of the version file. Our algorithm, hsadelta
(hash suffix array delta), finds the best matches for
every offset of the version file, with respect to a
certain granularity and above a certain length
threshold. The algorithm has two variations depending
on how we choose the block size. We show that if the
block size is kept fixed, the compression performance
of the algorithm is similar to that of the greedy
algorithm, without the associated expensive space and
time requirements. If the block size is varied linearly
with the reference file size, the algorithm can run in
linear time and constant space. We also show
empirically that the algorithm performs better than
other state-of-the-art differential compression
algorithms in terms of compression and is comparable in
speed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0246-00",
}
@Article{Altman:2006:P,
author = "E. Altman and S. Sathayes",
title = "Preface",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "169--171",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Agerwala:2006:SRC,
author = "T. Agerwala and M. Gupta",
title = "Systems research challenges: a scale-out
perspective",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "173--180",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/agerwala.html",
abstract = "A scale-out system is a collection of interconnected,
modular, low- cost computers that work as a single
entity to cooperatively provide applications, systems
resources, and data to users. The dominant programming
model for such systems consists of message passing at
the systems level and multithreading at the element
level. Scale-out computers have traditionally been
developed and deployed to provide levels of performance
(throughput and parallel processing) beyond what was
achievable by large shared-memory computers that
utilized the fastest processors and the most expensive
memory systems. Today, exploiting scale-out at all
levels in systems is becoming imperative in order to
overcome a fundamental discontinuity in the development
of microprocessor technology caused by power
dissipation. The pervasive use of greater levels of
scale-out, on the other hand, creates its own
challenges in architecture, programming, systems
management, and reliability. This position paper
identifies some of the important research problems that
must be addressed in order to deal with the technology
disruption and fully realize the opportunity offered by
scale-out. Our examples are based on parallelism, but
the challenges we identify apply to scale-out more
generally.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Wilcke:2006:IIB,
author = "W. W. Wilcke and R. B. Garner and C. Fleiner and R. F.
Freitas and R. A. Golding and J. S. Glider and D. R.
Kenchammana-Hosekote and J. L. Hafner and K. M.
Mohiuddin and KK Rao and R. A. Becker-Szendy and T. M.
Wong and O. A. Zaki and M. Hernandez and K. R.
Fernandez and H. Huels and H. Lenk and K. Smolin and M.
Ries and C. Goettert and T. Picunko and B. J. Rubin and
H. Kahn and T. Loo",
title = "{IBM Intelligent Bricks} project---Petabytes and
beyond",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "181--197",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/wilcke.html",
abstract = "This paper provides an overview of the Intelligent
Bricks project in progress at IBM Research. It
describes common problems faced by data center
operators and proposes a comprehensive solution based
on brick architectures. Bricks are hardware building
blocks. Because of certain properties, defined here,
scalable and reliable systems can be built with
collections of identical bricks. An important feature
is that brick-based systems must survive the failure of
any brick without requiring human intervention, as long
as most bricks are operational. This simplifies system
management and allows very dense and very scalable
systems to be built. A prototype storage server in the
form of a 3 3 3 3 3 array of bricks, capable of storing
26 TB, is operational at the IBM Almaden Research
Center. It successfully demonstrates the concepts of
the Intelligent Bricks architecture. The paper
describes this implementation of brick architectures
based on newly developed communication and cooling
technologies, the software developed, and techniques
for building very reliable systems from low-cost
bricks, and it discusses the performance and the future
of intelligent brick systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Fleiner:2006:RMM,
author = "C. Fleiner and R. B. Garner and J. L. Hafner and KK
Rao and D. R. Kenchammana-Hosekote and W. W. Wilcke and
J. S. Glider",
title = "Reliability of modular mesh-connected intelligent
storage brick systems",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "199--208",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/fleiner.html",
abstract = "A key objective of the IBM Intelligent Bricks project
is to create a highly reliable system from commodity
components. We envision such systems to be architected
for a service model called fail-in- place or deferred
maintenance. By delaying service actions, possibly for
the entire lifetime of the system, management of the
system is simplified. This paper examines the hardware
reliability and deferred maintenance of intelligent
storage brick (ISB) systems assuming a mesh-connected
collection of bricks in which each brick includes
processing power, memory, networking, and storage. On
the basis of Monte Carlo simulations, we quantify the
fraction of bricks that become unusable by a
distributed data redundancy scheme due to degrading
internal bandwidth and loss of external host
connectivity. We derive a system hardware reliability
expression and predict the length of time ISB systems
can operate without replacement of failed bricks. We
also show via a Markov analysis the level of fault
tolerance that is required by the data redundancy
scheme to achieve a goal of less than two data loss
events per exabyte-year due to multiple failures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Bacon:2006:BFL,
author = "D. F. Bacon and X. Shen",
title = "Braids and fibers: Language constructs with
architectural support for adaptive responses to memory
latencies",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "209--221",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/bacon.html",
abstract = "As processor speeds continue to increase at a much
higher rate than memory speeds, memory latencies may
soon approach a thousand processor cycles. As a result,
the flat memory model that was made practical by deeply
pipelined superscalar processors with multilevel caches
will no longer be tenable. The most common approach to
this problem is multithreading; however, multithreading
requires either abundant independent applications or
well-parallelized monolithic applications, and neither
is easy to come by. We present high-level programming
constructs called braids and fibers. The programming
constructs facilitate the creation of programs that are
partially ordered, in which the partial orders can be
used to support adaptive responses to memory access
latencies. Braiding is simpler than parallelizing,
while yielding many of the same benefits. We show how
the programming constructs can be effectively supported
with simple instruction set architecture extensions and
microarchitectural enhancements. We have developed
braided versions of a number of important algorithms.
The braided code is easy to understand at the source
level and can be translated into highly efficient
instructions using our architecture extensions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Dongarra:2006:SAN,
author = "J. Dongarra and G. Bosilca and Z. Chen and V. Eijkhout
and G. E. Fagg and E. Fuentes and J. Langou and P.
Luszczek and J. Pjesivac-Grbovic and K. Seymour and H.
You and S. S. Vadhiyar",
title = "{Self-Adapting Numerical Software} ({SANS}) effort",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "223--238",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/dongarra.html",
abstract = "The challenge for the development of next-generation
software is the successful management of the complex
computational environment while delivering to the
scientist the full power of flexible compositions of
the available algorithmic alternatives. Self-adapting
numerical software (SANS) systems are intended to meet
this significant challenge. The process of arriving at
an efficient numerical solution of problems in
computational science involves numerous decisions by a
numerical expert. Attempts to automate such decisions
distinguish three levels: algorithmic decision,
management of the parallel environment, and
processor-specific tuning of kernels. Additionally, at
any of these levels we can decide to rearrange the
user's data. In this paper we look at a number of
efforts at the University of Tennessee to investigate
these areas.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Cascaval:2006:PEM,
author = "C. Ca{\c{s}}caval and E. Duesterwald and P. F. Sweeney
and R. W. Wisniewski",
title = "Performance and environment monitoring for continuous
program optimization",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "239--248",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/cascaval.html",
abstract = "Our research is aimed at characterizing,
understanding, and exploiting the interactions between
hardware and software to improve system performance. We
have developed a paradigm for continuous program
optimization (CPO) that assists in and automates the
challenging task of performance tuning, and we have
implemented an initial prototype of this paradigm. At
the core of our implementation is a performance- and
environment-monitoring (PEM) component that vertically
integrates performance events from various layers in
the execution stack. CPO agents use the data provided
by PEM to detect, diagnose, and alleviate performance
problems on existing systems. In addition, CPO can be
used to improve future architecture designs by
analyzing PEM data collected on a whole-system
simulator while varying architectural characteristics.
In this paper, we present the CPO paradigm, describe an
initial implementation that includes PEM as a
component, and discuss two CPO clients.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Kandaswamy:2006:BWS,
author = "G. Kandaswamy and L. Fang and Y. Huang and S.
Shirasuna and S. Marru and D. Gannon",
title = "Building {Web} services for scientific grid
applications",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "249--260",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/kandaswamy.html",
abstract = "Web service architectures have gained popularity in
recent years within the scientific grid research
community. One reason for this is that web services
allow software and services from various organizations
to be combined easily to provide integrated and
distributed applications. However, most applications
developed and used by scientific communities are not
web-service-oriented, and there is a growing need to
integrate them into grid applications based on
service-oriented architectures. In this paper, we
describe a framework that allows scientists to provide
a web service interface to their existing applications
as web services without having to write extra code or
modify their applications in any way. In addition,
application providers do not need to be experts in web
services standards, such as Web Services Description
Language, Web Services Addressing, Web Services
Security, or secure authorization, because the
framework automatically generates these details. The
framework also enables users to discover these
application services, interact with them, and compose
scientific workflows from the convenience of a grid
portal.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Shetty:2006:HHT,
author = "R. Shetty and M. Kharbutli and Y. Solihin and M.
Prvulovic",
title = "{HeapMon}: a helper-thread approach to programmable,
automatic, and low-overhead memory bug detection",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "261--275",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/shetty.html",
abstract = "The ability to detect and pinpoint memory-related bugs
in production runs is important because in-house
testing may miss bugs. This paper presents HeapMon, a
heap memory bug-detection scheme that has a very low
performance overhead, is automatic, and is easy to
deploy. HeapMon relies on two new techniques. First, it
decouples application execution from bug monitoring,
which executes as a helper thread on a separate core in
a chip multiprocessor system. Second, it associates a
filter bit with each cached word to safely and
significantly reduce bug checking frequency--by 95\% on
average. We test the effectiveness of these techniques
using existing and injected memory bugs in SPEC 2000
applications and show that HeapMon effectively detects
and identifies most forms of heap memory bugs. Our
results also indicate that the HeapMon performance
overhead is only 5\%, on average--orders of magnitude
less than existing tools. Its overhead is also modest:
3.1\% of the cache size and a 32-KB victim cache for
on-chip filter bits and 6.2\% of the allocated heap
memory size for state bits, which are maintained by the
helper thread as a software data structure.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Belluomini:2006:LSD,
author = "W. Belluomini and D. Jamsek and A. K. Martin and C.
McDowell and R. K. Montoye and H. C. Ngo and
J. Sawada",
title = "Limited switch dynamic logic circuits for high-speed
low-power circuit design",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "277--286",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/belluomini.html",
abstract = "This paper describes a new circuit family--limited
switch dynamic logic (LSDL). LSDL is a hybrid between a
dynamic circuit and a static latch that combines the
desirable properties of both circuit families. The
paper also describes many enhancements and extensions
to LSDL that increase its logical capability. Finally,
it presents the results of two multiplier designs, one
fabricated in 130- nm technology and one in 90-nm
technology. The 130- and 90-nm designs respectively
reach speeds up to 2.2 GHz and 8 GHz.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Baugh:2006:DLQ,
author = "L. Baugh and C. Zilles",
title = "Decomposing the load--store queue by function for
power reduction and scalability",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "287--297",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/baugh.html",
abstract = "Because they are based on large, content-addressable
memories, load\slash store queues (LSQs) present
implementation challenges in superscalar processors. In
this paper, we propose an alternate LSQ organization
that separates the time-critical forwarding
functionality from the process of checking that loads
received their correct values. Two main techniques are
exploited: First, the store- forwarding logic is
accessed only by those loads and stores that are likely
to be involved in forwarding, and second, the checking
structure is banked by address. The result of these
techniques is that the LSQ can be implemented by a
collection of small, low- bandwidth structures yielding
an estimated three to five times reduction in LSQ
dynamic power.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Cheng:2006:HQI,
author = "A. C. Cheng and G. S. Tyson",
title = "High-quality {ISA} synthesis for low-power cache
designs in embedded microprocessors",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "299--309",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/cheng.html",
abstract = "Energy efficiency, performance, area, and cost are
critical concerns in designing microprocessors for
embedded systems, such as portable handheld computing
and personal telecommunication devices. This work
introduces framework-based instruction set architecture
(ISA) synthesis, which reduces code size and energy
consumption by tailoring the instruction set to the
requirement of a targeted application. This is achieved
by replacing the fixed instruction and register
decoding of general-purpose embedded processors with
programmable decoders that can achieve
application-specific processor performance, low energy
consumption, and smaller code size while maintaining
the fabrication advantages of a mass-produced
single-chip solution. Experimental results show that
our synthesized instruction set results in significant
power reduction in the L1 instruction cache compared
with ARM instructions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Carter:2006:MWD,
author = "N. P. Carter and A. Hussain",
title = "Modeling wire delay, area, power, and performance in a
simulation infrastructure",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "311--319",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/carter.html",
abstract = "We present Justice, a set of extensions to the Liberty
simulation infrastructure that model chip area, wire
length, and power consumption. Based on an
architectural specification of a processor, Justice
estimates the area and per-access power consumption of
each module in the architecture. It then constructs a
floorplan for the processor and computes the length and
delay of critical communication paths. Finally, Justice
modifies the architectural specification to account for
wire delay and generates an executable simulator for
the processor. To illustrate its capabilities, we
simulate a number of very long instruction word (VLIW)
architectures. Our results illustrate how Justice makes
it possible for designers to compare the costs and
benefits of different changes to an architecture and
demonstrate the importance of considering wire delay
early in the design process.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Peterson:2006:AFS,
author = "J. L. Peterson and P. J. Bohrer and L. Chen and E. N.
Elnozahy and A. Gheith and R. H. Jewell and M. D.
Kistler and T. R. Maeurer and S. A. Malone and D. B.
Murrell and N. Needel and K. Rajamani and M. A. Rinaldi
and R. O. Simpson and K. Sudeep and L. Zhang",
title = "Application of full-system simulation in exploratory
system design and development",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "321--332",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/502/peterson.html",
abstract = "This paper describes the design and application of a
full-system simulation environment that has been widely
used in the exploration of the IBM PowerPC processor
and system design. The IBM full-system simulator has
been developed to meet the needs of hardware and
software designers for fast, accurate, execution-driven
simulation of complete systems, incorporating
parameterized architectural models. This environment
enables the development and tuning of production-level
operating systems, compilers, and critical software
support well in advance of hardware availability, which
can significantly shorten the critical path of system
development. The ability to develop early versions of
software can benefit hardware development by
identifying design issues that may affect functionality
and performance far earlier in the development cycle,
when they are much less costly to correct. In this
paper, we describe features of the simulation
environment and present examples of its application in
the context of the Sony\slash Toshiba\slash IBM Cell
Broadband Enginee and IBM PERCS development projects.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Anonymous:2006:EDM,
author = "Anonymous",
title = "Erratum: {{\em Development of the magnetic tunnel
junction MRAM at IBM}}",
journal = j-IBM-JRD,
volume = "50",
number = "2/3",
pages = "333--333",
month = mar # "\slash " # may,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Gallagher:2006:DMT}.",
URL = "http://www.research.ibm.com/journal/rd/502/erratum.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0247-00",
}
@Article{Haensch:2006:P,
author = "W. Haensch and M. Ieongs",
title = "Preface",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "337--338",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Haensch:2006:SCD,
author = "W. Haensch and E. J. Nowak and R. H. Dennard and P. M.
Solomon and A. Bryant and O. H. Dokumaci and A. Kumar
and X. Wang and J. B. Johnson and M. V. Fischetti",
title = "Silicon {CMOS} devices beyond scaling",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "339--362",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See erratum \cite{Anonymous:2006:ESC}.",
URL = "http://www.research.ibm.com/journal/rd/504/haensch.html",
abstract = "To a large extent, scaling was not seriously
challenged in the past. However, a closer look reveals
that early signs of scaling limits were seen in
high-performance devices in recent technology nodes. To
obtain the projected performance gain of 30\% per
generation, device designers have been forced to relax
the device subthreshold leakage continuously from one
to several nA/lm for the 250-nm node to hundreds of
nA/lm for the 65-nm node. Consequently, passive power
density is now a significant portion of the power
budget of a high-speed microprocessor. In this paper we
discuss device and material options to improve device
performance when conventional scaling is
power-constrained. These options can be separated into
three categories: improved short-channel behavior,
improved current drive, and improved switching
behavior. In the first category fall advanced
dielectrics and multi-gate devices. The second category
comprises mobility-enhancing measures through stress
and substrate material alternatives. The third category
focuses mainly on scaling of SOI body thickness to
reduce capacitance. We do not provide details of the
fabrication of these different device options or the
manufacturing challenges that must be met. Rather, we
discuss the fundamental scaling issues related to the
various device options. We conclude with a brief
discussion of the ultimate FET close to the fundamental
silicon device limit.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Antoniadis:2006:CMP,
author = "D. A. Antoniadis and I. Aberg and C. N{\'\i}
Chl{\'e}irigh and O. M. Nayfeh and A. Khakifirooz and
J. L. Hoyt",
title = "Continuous {MOSFET} performance increase with device
scaling: The role of strain and channel material
innovations",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "363--376",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See erratum \cite{Anonymous:2006:ESC}.",
URL = "http://www.research.ibm.com/journal/rd/504/antoniadis.html",
abstract = "A simple model that links MOSFET performance, in the
form of intrinsic switch delay, to effective carrier
velocity in the channel is developed and fitted to
historical data. It is shown that nearly continuous
carrier velocity increase, most recently via the
introduction of process-induced strain, has been
responsible for the device performance increase
commensurately with dimensional scaling. The paper
further examines channel material innovations that will
be required in order to maintain continued commensurate
scaling beyond what can be achieved with
process-induced strain, and discusses some of the
technological tradeoffs that will have to be faced for
their introduction.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Shang:2006:GCM,
author = "H. Shang and M. M. Frank and E. P. Gusev and J. O. Chu
and S. W. Bedell and K. W. Guarini and M. Ieong",
title = "Germanium channel {MOSFET}s: Opportunities and
challenges",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "377--386",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/shang.html",
abstract = "This paper reviews progress and current critical
issues with respect to the integration of germanium
(Ge) surface-channel MOSFET devices as well as
strained-Ge buried-channel MOSFET structures. The
device design and scalability of strained-Ge
buried-channel MOSFETs are discussed on the basis of
our recent results. CMOS- compatible integration
approaches of Ge channel devices are presented.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Gusev:2006:AHK,
author = "E. P. Gusev and V. Narayanan and M. M. Frank",
title = "Advanced high-{$\kappa$} dielectric stacks with
{polySi} and metal gates: Recent progress and current
challenges",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "387--410",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/gusev.html",
abstract = "The paper reviews our recent progress and current
challenges in implementing advanced gate stacks
composed of high-j dielectric materials and metal gates
in mainstream Si CMOS technology. In particular, we
address stacks of doped polySi gate electrodes on
ultrathin layers of high-j dielectrics,
dual-workfunction metal-gate technology, and fully
silicided gates. Materials and device characterization,
processing, and integration issues are discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Hiramoto:2006:ENS,
author = "T. Hiramoto and M. Saitoh and G. Tsutsui",
title = "Emerging nanoscale silicon devices taking advantage of
nanostructure physics",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "411--418",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/hiramoto.html",
abstract = "This paper describes the present status of research on
emerging nanoscale silicon devices that take full
advantage of new physical phenomena which appear in
silicon nanostructures. This new physics includes
quantum effects that enhance the performance of MOS
transistors and single-electron charging effects that
add new function to conventional CMOS circuits. These
physical phenomena may be used to extend the scaling
and performance limits of conventional CMOS.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Frank:2006:OCT,
author = "D. J. Frank and W. Haensch and G. Shahidi and O. H.
Dokumaci",
title = "Optimizing {CMOS} technology for maximum performance",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "419--431",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/frank.html",
abstract = "Since power dissipation is becoming a dominant
limitation on the continued improvement of CMOS
technology, technologists must understand the best way
to design transistors in the presence of power
constraints. The primary objective is to obtain as much
performance as possible for a fixed amount of power,
and it is chip performance, not device performance,
that matters. In order to investigate this regime, we
have captured in simplified models the basic elements
for determining chip performance, including intrinsic
transistor characteristics, circuit delay, tolerance
issues, basic microprocessor composition, and power
dissipation and heat removal considerations. These
models have been assembled in a processor-level
technology-optimization program to study the
characteristics of optimal technology across many
generations of CMOS. The results that are presented
elucidate the limits of future CMOS technology
improvements, the optimal energy consumption
conditions, and the relative benefits of various
proposed technology enhancements, including high-k gate
insulators, metal gates, high- mobility semiconductors,
improved heat removal, and the use of multiple layers
of circuitry.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Bernstein:2006:HPC,
author = "K. Bernstein and D. J. Frank and A. E. Gattiker and W.
Haensch and B. L. Ji and S. R. Nassif and E. J. Nowak
and D. J. Pearson and N. J. Rohrer",
title = "High-performance {CMOS} variability in the 65-nm
regime and beyond",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "433--449",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/bernstein.html",
abstract = "Recent changes in CMOS device structures and materials
motivated by impending atomistic and quantum-mechanical
limitations have profoundly influenced the nature of
delay and power variability. Variations in process,
temperature, power supply, wear-out, and use history
continue to strongly influence delay. The manner in
which tolerance is specified and accommodated in
high-performance design changes dramatically as CMOS
technologies scale beyond a 90-nm minimum lithographic
linewidth. In this paper, predominant contributors to
variability in new CMOS devices are surveyed, and
preferred approaches to mitigate their sources of
variability are proposed. Process-, device-, and
circuit-level responses to systematic and random
components of tolerance are considered. Exploratory,
novel structures emerging as evolutionary CMOS
replacements are likely to change the nature of
variability in the coming generations.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Ketchen:2006:PRS,
author = "M. B. Ketchen and M. Bhushan",
title = "Product-representative ``at speed'' test structures
for {CMOS} characterization",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "451--468",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/ketchen.html",
abstract = "The design of product-representative test structures
for measuring and characterizing CMOS circuit
performance, power, and variability at speeds
characteristic of present-day microprocessors is
described. The current use of this set of test
structures in the IBM partially depleted
silicon-on-insulator CMOS technologies covers
diagnostics in early process development, monitoring
mature processes in manufacturing, enabling
model-to-hardware correlation, and tracking product
performance. The designs focus on measuring
high-frequency performance early in the product
fabrication cycle while minimizing test and data
analysis time. The physical layouts are compact,
facilitating placement in the chip. A subset of these
test structures can be measured at the first metal
level, while more complex designs use three or more
metal layers. Most designs are compatible with standard
in-line parametric test equipment, although a limited
number of bench tests continue to play an important
role. Differential measurement techniques are key to
many of the test structure designs. Hardware data
analysis also relies heavily on differencing schemes
for relating MOSFET parameters and associated parasitic
components to circuit delays in a self-consistent
manner.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Hanson:2006:UVM,
author = "S. Hanson and B. Zhai and K. Bernstein and D. Blaauw
and A. Bryant and L. Chang and K. K. Das and W. Haensch
and E. J. Nowak and D. M. Sylvester",
title = "Ultralow-voltage, minimum-energy {CMOS}",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "469--490",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/hanson.html",
abstract = "Energy efficiency has become a ubiquitous design
requirement for digital circuits. Aggressive
supply-voltage scaling has emerged as the most
effective way to reduce energy use. In this work, we
review circuit behavior at low voltages, specifically
in the subthreshold (Vdd, Vth) regime, and suggest new
strategies for energy-efficient design. We begin with a
study at the device level, and we show that extreme
sensitivity to the supply and threshold voltages
complicates subthreshold design. The effects of this
sensitivity can be minimized through simple device
modifications and new device geometries. At the circuit
level, we review the energy characteristics of
subthreshold logic and SRAM circuits, and demonstrate
that energy efficiency relies on the balance between
dynamic and leakage energies, with process variability
playing a key role in both energy efficiency and
robustness. We continue the study of energy-efficient
design by broadening our scope to the architectural
level. We discuss the energy benefits of techniques
such as multiple-threshold CMOS (MTCMOS) and adaptive
body biasing (ABB), and we also consider the
performance benefits of multiprocessor design at
ultralow supply voltages.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Topol:2006:TDI,
author = "A. W. Topol and D. C. {La Tulipe, Jr.} and L. Shi and
D. J. Frank and K. Bernstein and S. E. Steen and
A. Kumar and G. U. Singco and A. M. Young and
K. W. Guarini and M. Ieong",
title = "Three-dimensional integrated circuits",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "491--506",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/topol.html",
abstract = "Three-dimensional (3D) integrated circuits (ICs),
which contain multiple layers of active devices, have
the potential to dramatically enhance chip performance,
functionality, and device packing density. They also
provide for microchip architecture and may facilitate
the integration of heterogeneous materials, devices,
and signals. However, before these advantages can be
realized, key technology challenges of 3D ICs must be
addressed. More specifically, the processes required to
build circuits with multiple layers of active devices
must be compatible with current state-of-the-art
silicon processing technology. These processes must
also show manufacturability, i.e., reliability, good
yield, maturity, and reasonable cost. To meet these
requirements, IBM has introduced a scheme for building
3D ICs based on the layer transfer of functional
circuits, and many process and design innovations have
been implemented. This paper reviews the process steps
and design aspects that were developed at IBM to enable
the formation of stacked device layers. Details
regarding an optimized layer transfer process are
presented, including the descriptions of (1) a glass
substrate process to enable through-wafer alignment;
(2) oxide fusion bonding and wafer bow compensation
methods for improved alignment tolerance during
bonding; (3) and a single-damascene patterning and
metallization method for the creation of
high-aspect-ratio (6:1, AR, 11:1) contacts between
two stacked device layers. This process provides the
shortest distance between the stacked layers (,2 lm),
the highest interconnection density (.108 vias/cm2),
and extremely aggressive wafer-to-wafer alignment
(submicron) capability.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Franaszek:2006:VMC,
author = "P. A. Franaszek and L. A. Lastras-Monta{\~n}o and S.
R. Kunkel and A. C. Sawdey",
title = "Victim management in a cache hierarchy",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "507--523",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/franaszek.html",
abstract = "We investigate directions for exploiting what might be
termed pattern locality in a cache hierarchy, based on
recording cache discards or victims. An advantage of
storing discard decisions is the reduced duplication of
pertinent information, as well as the maintenance of
information on the current location of discarded lines.
Typical caches are designed to exploit combinations of
temporal and spatial locality. Temporal locality, the
likelihood that recently referenced data will be
referenced again, is exploited by LRU-like algorithms.
Spatial locality is the property that causes larger
cache lines to yield improved miss ratios. Here we
consider the exploitation of pattern locality--the
property that lines accessed in temporal proximity tend
to be re-referenced together. We describe some new
cache structures including pattern-recording features,
along with their miss ratio and transfer traffic
performance as determined via simulations on traces
drawn from several benchmark applications. We show that
pattern locality information, based on discard
statistics, can be useful in enhancing the quality of
prefetch decisions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Chen:2006:MVP,
author = "T.-C. Chen",
title = "Message from the {Vice President, Science and
Technology, IBM Research Division}",
journal = j-IBM-JRD,
volume = "50",
number = "4/5",
pages = "??--??",
month = jul # "\slash " # sep,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:31 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/504/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0248-00",
}
@Article{Burbeck:2006:P,
author = "S. Burbeck and K. E. Jordans",
title = "Preface",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "527--528",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Burbeck:2006:ARC,
author = "S. Burbeck and K. E. Jordan",
title = "An assessment of the role of computing in systems
biology",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "529--543",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/burbeck.html",
abstract = "Systems biology is a burgeoning field in which
researchers are investigating a flood of new data that
is gathered in high- throughput genomics, proteomics,
and related analyses. Systems biologists focus on what
this data reveals about the functioning of living
systems. The large volume of data, and the complexity
of living systems, ensures that computing plays a
central role in analyzing, modeling, and simulating
these systems. In this paper, we discuss some of the
key challenges in the field of computational systems
biology. We also discuss possible ways in which the
field of systems biology may evolve in coming years,
along with some of the demands that systems biology
research places on computing resources.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Eckman:2006:GDM,
author = "B. A. Eckman and P. G. Brown",
title = "Graph data management for molecular and cell biology",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "545--560",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/eckman.html",
abstract = "As high-throughput biology begins to generate large
volumes of systems biology data, the need grows for
robust, efficient database systems to support
investigations of metabolic and signaling pathways,
chemical reaction networks, gene regulatory networks,
and protein interaction networks. Network data is
frequently represented as graphs, and researchers need
to navigate, query and manipulate this data in ways
that are not well supported by standard relational
database management systems (RDBMSs). Current
approaches to managing graphs in an RDBMS rely on
either external procedural logic to execute the graph
algorithms or clumsy and inefficient algorithms
implemented in Structured Query Language (SQL). In this
paper we describe the Systems Biology Graph Extender, a
research prototype that extends the IBM RDBMS--DB2t
Universal Database software--with graph objects and
operations to support declarative SQL queries over
biological networks and other graph structures.
Supported operations include neighborhood queries,
shortest path queries, spanning trees, graph
transposition, and graph matching. In a federated
database environment, graph operations may be applied
to data stored in any format, whether remote or local,
relational or nonrelational. A single federated query
may include both graph- based predicates and predicates
over related data sources, such as microarray
expression levels, clinical prognosis and outcome, or
the function of orthologous proteins (i.e., proteins
that are evolutionarily related to those in another
species) in mouse disease models.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Sorokin:2006:PET,
author = "A. Sorokin and K. Paliy and A. Selkov and O. V. Demin
and S. Dronov and P. Ghazal and I. Goryanin",
title = "The {Pathway Editor}: a tool for managing complex
biological networks",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "561--573",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/sorokin.html",
abstract = "Biological networks are systems of biochemical
processes inside a cell that involve cellular
constituents such as DNA, RNA, proteins, and various
small molecules. Pathway maps are often used to
represent the structure of such networks with
associated biological information. Several pathway
editors exist, and they vary according to specific
domains of knowledge. This paper presents a review of
existing pathway editors, along with an introduction to
the Edinburgh Pathway Editor (EPE). EPE was designed
for the annotation, visualization, and presentation of
a wide variety of biological networks that include
metabolic, genetic, and signal transduction pathways.
EPE is based on a metadata-driven architecture. The
editor supports the presentation and annotation of
maps, in addition to the storage and retrieval of
reaction kinetics information in relational databases
that are either local or remote. EPE also has
facilities for linking graphical objects to external
databases and Web resources, and is capable of
reproducing most existing graphical notations and
visual representations of pathway maps. In summary, EPE
provides a highly flexible tool for combining
visualization, editing, and database manipulation of
information relating to biological networks. EPE is
open-source software, distributed under the Eclipse
open-source application platform license.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Podowski:2006:VCS,
author = "R. M. Podowski and B. Miller and W. W. Wasserman",
title = "Visualization of complementary systems biology data
with parallel heatmaps",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "575--581",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/podowski.html",
abstract = "The interpretation of large-scale biological data can
be aided by the use of appropriate visualization tools.
Heatmaps--pattern- revealing aggregate views of
data--have emerged as a preferred technique for the
display of genomics data, since they provide an extra
dimension of information in a two-dimensional display.
However, an increasing focus on the integration of data
from multiple sources has created a need for the
display of additional dimensions. To improve the
identification of relationships between co-expressed
genes identified in microarray experiments, a parallel
dataset heatmap viewer has been developed for
four-dimensional data display. The flexible data entry
structure of the parallel heatmap viewer facilitates
the display of both continuous and discrete data.
Specific examples are presented for the analysis of
diverse functional genomics yeast data related to gene
regulation, expression, and annotation. The parallel
heatmap viewer enables knowledgeable life science
researchers to observe patterns and properties within
high-throughput genomics data in order to rapidly
identify biologically logical relationships.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Hussan:2006:SDM,
author = "J. Hussan and P. P. de Tombe and J. J. Rice",
title = "A spatially detailed myofilament model as a basis for
large-scale biological simulations",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "583--600",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/hussan.html",
abstract = "The availability of increased computing power will
make possible new classes of biological models that
include detailed representations of proteins and
protein complexes with spatial interactions. We develop
such a model of the interaction of actin and myosin
within one pair of thick and thin filaments in the
cardiac sarcomere. The model includes explicit
representations of actin, myosin, and regulatory
proteins. Although this is not an atomic-scale model,
as would be the case for molecular dynamics
simulations, the model seeks to represent spatial
interactions between protein complexes that are thought
to produce characteristic cardiac muscle responses at
larger scales. While the model simulates the
microscopic scale, when model results are extrapolated
to larger structures, the model recapitulates complex,
nonlinear behavior such as the steep calcium
sensitivity of developed force in muscle structures. By
bridging spatial scales, the model provides a plausible
and quantitative explanation for several unexplained
phenomena observed at the tissue level in cardiac
muscles. Model execution entails Monte-Carlo-based
simulations of Markov representations of calcium
regulation and actin\slash myosin interactions. While
most of the results presented here are preliminary, we
suggest that this model will be suitable to serve as a
basis for larger-scale simulations of multiple fibers
assembled into larger sarcomere structures.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Peirce:2006:MBI,
author = "S. M. Peirce and T. C. Skalak and J. A. Papin",
title = "Multiscale biosystems integration: Coupling
intracellular network analysis with tissue-patterning
simulations",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "601--615",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/peirce.html",
abstract = "In order to achieve a comprehensive understanding of
complex biological systems, researchers must develop
new techniques that incorporate key features of the
system across all relevant spatial and temporal scales.
Recent advances in molecular biology and genetics have
generated a wealth of experimental data that provides
details with respect to gene-expression patterns and
individual gene and protein functions, but integration
of this information into meaningful knowledge of the
complete system is a challenge borne by a new
scientific era dependent on computational tools. In
this paper, we review new computational techniques,
developed to reconstruct single-cell biochemical
networks for generating quantitative descriptions of
network properties, and agent-based models designed to
study multicell interactions important in tissue
patterning. We also discuss the challenges and promises
of combining these approaches in a single quantitative
framework for advancing medical care for diseases that
arise from a multitude of factors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Nickerson:2006:CMM,
author = "D. Nickerson and M. Nash and P. Nielsen and N. Smith
and P. Hunter",
title = "Computational multiscale modeling in the {IUPS
Physiome Project}: Modeling cardiac electromechanics",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "617--630",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/nickerson.html",
abstract = "We present a computational modeling and numerical
simulation framework that enables the integration of
multiple physics and spatiotemporal scales in models of
physiological systems. This framework is the foundation
of the IUPS (International Union of Physiological
Sciences) Physiome Project. One novel aspect is the use
of CellML, an annotated mathematical representation
language, to specify model- and simulation-specific
equations. Models of cardiac electromechanics at the
cellular, tissue, and organ spatial scales are outlined
to illustrate the development and implementation of the
framework. We quantify the computational demands of
performing simulations using such models and compare
models of differing biophysical detail. Applications to
other physiological systems are also discussed.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Holloway:2006:MLM,
author = "D. T. Holloway and M. A. Kon and C. DeLisi",
title = "Machine learning methods for transcription data
integration",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "631--643",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/holloway.html",
abstract = "Gene expression is modulated by transcription factors
(TFs), which are proteins that generally bind to DNA
adjacent to coding regions and initiate transcription.
Each target gene can be regulated by more than one TF,
and each TF can regulate many targets. For a complete
molecular understanding of transcriptional regulation,
researchers must first associate each TF with the set
of genes that it regulates. Here we present a summary
of completed work on the ability to associate 104 TFs
with their binding sites using support vector machines
(SVMs), which are classification algorithms based in
statistical learning theory. We use several types of
genomic datasets to train classifiers in order to
predict TF binding in the yeast genome. We consider
motif matches, subsequence counts, motif conservation,
functional annotation, and expression profiles. A
simple weighting scheme varies the contribution of each
type of genomic data when building a final SVM
classifier, which we evaluate using known binding sites
published in the literature and in online databases.
The SVM algorithm works best when all datasets are
combined, producing 73\% coverage of known
interactions, with a prediction accuracy of almost 0.9.
We discuss new ideas and preliminary work for improving
SVM classification of biological data.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Schoeberl:2006:MBD,
author = "B. Schoeberl and U. B. Nielsen and R. Paxson",
title = "Model-based design approaches in drug discovery: a
parallel to traditional engineering approaches",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "645--651",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/schoeberl.html",
abstract = "Model-based design (MBD) has been successfully applied
in the automotive, chemical, and aerospace industries.
Here we discuss the possible application of
engineering-based MBD approaches to drug discovery. One
of the biggest challenges in drug discovery is the high
attrition rate of new drugs in development: Many
promising candidates prove ineffective or toxic in
animal or human testing. More often than not, these
failures are the result of a poor understanding of the
molecular mechanisms of the biological systems they
target. Recent advances in biological systems modeling
make MBD an attractive approach to improve drug
development. We elaborate on the view that the
pharmaceutical industry should be able to use MBD to
design new drugs more effectively. There are
significant differences between drug discovery and
traditional engineering that lead to specific MBD
requirements. We delineate those differences and
introduce suggestions to overcome them.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Anonymous:2006:AIV,
author = "Anonymous",
title = "Author index for Volume 50",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "653--657",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/authv50.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Anonymous:2006:SIV,
author = "Anonymous",
title = "Subject index for Volume 50",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "659--663",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/subjv50.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Anonymous:2006:ESC,
author = "Anonymous",
title = "Errata: {{\em Silicon CMOS Devices Beyond Scaling}}
and {{\em Continuous MOSFET Performance Increase with
Device Scaling}}",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "665--665",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Haensch:2006:SCD} and
\cite{Antoniadis:2006:CMP}.",
URL = "http://www.research.ibm.com/journal/rd/506/errata.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Kovac:2006:MGM,
author = "Caroline A. Kovac",
title = "Message from the {General Manager, Healthcare and Life
Sciences Industry, IBM Public Sector}",
journal = j-IBM-JRD,
volume = "50",
number = "6",
pages = "??--??",
month = nov,
year = "2006",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:16:32 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/506/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "G322-0249-00",
}
@Article{Turgeon:2007:P,
author = "P. R. Turgeon",
title = "Preface",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "3--??",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Poindexter:2007:OST,
author = "D. J. Poindexter and S. R. Stiffler and P. T. Wu and
P. D. Agnello and T. Ivers and S. Narasimha and T. B.
Faure and J. H. Rankin and D. A. Grosch and M. D. Knox
and D. Edelstein and M. Khare and G. B. Bronner and
H.-J. Nam and S. A. Butt",
title = "Optimization of silicon technology for the {IBM System
z9}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "5--??",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Mayer:2007:DMA,
author = "G. Mayer and G. Doettling and R. F. Rizzolo and C. J.
Berry and S. M. Carey and C. M. Carney and J. Keinert
and P. Loeffler and W. Nop and D. E. Skooglund and V.
A. Victoria and A. P. Wagstaff and P. M. Williams",
title = "Design methods for attaining {IBM System z9} processor
cycle-time goals",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "19--35",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/mayer.html",
abstract = "Cycle-time targets were set for the IBM System z9e
processor subsystem prior to building the system, and
achieving these targets was one of the biggest
challenges we faced during hardware development. In
particular, although the processor-subsystem cycle-time
improvement was driven primarily by the technology
migration from CMOS 9S (130-nm lithography) for the
prior IBM System z990 to CMOS 10S0 (90-nm lithography)
for the new system, the cooling capability for the
System z9 resulted from a direct migration of the
System z990 implementation with very limited
improvements. The higher device current leakage and
power associated with the technology migration,
combined with the fixed cooling capability, created a
technology challenge in which the subsystem cycle time
and performance were potentially limited by cooling
capability. Our solution emphasized silicon technology
development, chip design, and hardware characterization
and tuning. Ultimately, the System z9 processor
subsystem achieved operation at 1.7 GHz, which exceeded
the original target.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Harrer:2007:HSI,
author = "H. Harrer and D. M. Dreps and T.-M. Winkel and W.
Scholz and B. G. Truong and A. Huber and T. Zhou and K.
L. Christian and G. F. Goth",
title = "High-speed interconnect and packaging design of the
{IBM System z9} processor cage",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "37--52",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/harrer.html",
abstract = "This paper describes the system packaging and
technologies of the IBM System z9e enterprise-class
server. The central electronic complex of the system
consists of four nodes, each housing a multichip module
(MCM) with 16 chips consuming up to 1,200 W. The z9e
server doubles the multiprocessor performance of the
System z990 by increasing the central processing unit
(CPU) configuration and using an internally developed
elastic interface to increase interconnect speed on all
high-speed buses. In contrast to all previous zSeries
designs, which were running at half of the processor
speed, the packaging interconnects on the multichip
module run at the same speed as the processor (1.72
GHz). High frequencies and massively parallel
connectivity lead to a raw packaging bandwidth of up to
1,764 GB/s between processors and cache within a single
frame for a fully configured four-node z9 system.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Berger:2007:HSS,
author = "D. M. Berger and J. Y. Chen and F. D. Ferraiolo and J.
A. Magee and G. A. {Van Huben}",
title = "High-speed source-synchronous interface for the {IBM
System z9} processor",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "53--64",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/berger.html",
abstract = "As mainframes evolve and deliver higher performance,
technologists are focusing less on processor speed and
more on overall system performance to create optimized
systems. One important area of focus for performance
improvement involves chip-to-chip interconnects, with
their associated bandwidths and latencies. IBM and
related computer manufacturers are optimizing the
characteristics of interconnects between processors as
well as between processors and their supporting chip
sets (local cache, memory, I/O bridge). This paper
describes the IBM proprietary high-speed interface
known as Elastic Interface (EI), which is used for
nearly all chip-to-chip communication in the IBM System
z9e. In particular, EI is a generic high-speed,
source-synchronous interface used to transfer
addresses, controls, and data between CPUs, L2 caches,
memory subsystems, switches, and I/O hubs. The EI has
single-ended data lines, resulting in twice the
performance (bandwidth per pin) of similar buses
operating with two differential lines per signal.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Rizzolo:2007:ISZ,
author = "R. F. Rizzolo and T. G. Foote and J. M. Crafts and D.
A. Grosch and T. O. Leung and D. J. Lund and B. L.
Mechtly and B. J. Robbins and T. J. Slegel and M. J.
Tremblay and G. A. Wiedemeier",
title = "{IBM System z9 eFUSE} applications and methodology",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "65--??",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Wyman:2007:ZZI,
author = "L. W. Wyman and J. Casta{\~n}o and J. P. Kubala and R.
J. Maddison and B. R. Pierce and R. R. Rogers",
title = "{zAAPs} and {zIIPs}: Increasing the strategic value of
{System z}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "77--86",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/wyman.html",
abstract = "With the addition of IBM System z application assist
processors (zAAPs) and integrated information
processors (zIIPs) to the portfolio of special-purpose
IBM System z processors, the reinvention of the IBM
mainframe continues. Jointly, zAAPs and zIIPs provide
significant IBM System z9e integrated and
cost-effective processing cycles for today's strategic
Javae and DB2t for z/OS programming platforms which are
increasingly fundamental to enterprise-class business
environments. Overviews of zAAPs and zIIPs are
presented that describe their functionality, design,
and use by the z/OS operating system to achieve the
execution of both Java and z/OS DB2 programming
functions.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Arnold:2007:CSE,
author = "T. W. Arnold and A. Dames and M. D. Hocker and M. D.
Marik and N. A. Pellicciotti and K. Werner",
title = "Cryptographic system enhancements for the {IBM System
z9}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "87--102",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/arnold.html",
abstract = "IBM has offered hardware-based cryptographic
processors for its mainframe computers for nearly
thirty years. Over that period, IBM has continued to
update both the hardware and software, providing added
features, higher performance, greater physical
security, and improved management features. This
commitment continues with the System z9e, as
demonstrated by the two improvements described in this
paper. The first part of the paper describes
enhancements to the System z9 to configure and control
cryptographic features. The second part describes a new
method for the cryptographic coprocessors to securely
manage keys which are distributed to remote devices
that are not necessarily in secure or well-controlled
environments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Srikrishnan:2007:SFA,
author = "J. Srikrishnan and S. Amann and G. Banzhaf and F. W.
Brice and R. Dugan and G. R. Frazier and G. P. Kuch and
J. Leopold",
title = "Sharing {FCP} adapters through virtualization",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "103--118",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/srikrishnan.html",
abstract = "The IBM System z9e and its predecessors pioneered
server virtualization, including the sharing of data
storage subsystems among the virtual servers of a host
computer using the channel- sharing capabilities of
FICON channels in Fibre Channel (FC) fabrics. Now
industry-standard Small Computer System Interface
(SCSI) devices in storage area networks must be shared
among host computers using the Fibre Channel Protocol
(FCP), and this has been problematic with virtual
servers in a host computer. To apply the power of
server virtualization to this environment, the IBM
System z9 implements a new FC standard called N\_Port
Identifier Virtualization (NPIV). IBM invented NPIV and
offered it as a standard to enable the sharing of host
adapters in IBM servers and FC fabrics. With NPIV, a
host FC adapter is shared in such a way that each
virtual adapter is assigned to a virtual server and is
separately identifiable within the fabric. Connectivity
and access privileges within the fabric are controlled
by identification of each virtual adapter and, hence,
the virtual server using each virtual adapter. This
paper describes the problem prior to the development of
NPIV, the concept of NPIV, and the first implementation
of this technique in the FCP channel of the IBM System
z9.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Zee:2007:ISZ,
author = "M. Zee and J. W. Stevens and B. L. Thompson and J. A.
Fowler and J. Goldman and P. T. Chan and T. P.
McSweeney",
title = "{IBM System z9} Open Systems Adapter for Communication
Controller for {Linux}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "119--130",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/zee.html",
abstract = "The IBM 374x Communication Controllers, and the NCP
(network control program) software that runs on them,
have been at the center of the IBM SNA (Systems Network
Architecture) for many years. However, the 374x
hardware is no longer being produced. In order to
continue to offer IBM customers various functions
provided by the NCP product, IBM has developed a
Communication Controller for Linux (CCL) for the IBM
System z. CCL is a software program that emulates the
374x hardware, enabling the NCP to function in Linux.
IBM customers now have the ability to migrate their NCP
product to a Linux partition on System z. The current
NCP product, running on an IBM 374x Communication
Controller, supports both host channel and network
attachment. The channel protocol used for the
host-channel support is referred to as channel data
link control (CDLC). In order to provide the System z9e
host operating systems with the ability to attach to
the new CCL NCP over a channel interface, a new channel
adapter is required. The new innovative Open Systems
Adapter for NCP (OSN) channel support provided by the
OSA-Express2 allows various operating systems on the
same System z9 to attach ``internally'' to the CCL
without using any external network or channel fabric.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Oakes:2007:ESR,
author = "K. J. Oakes and U. Helmich and A. Kohler and A. W.
Piechowski and M. Taubert and J. S. Trotter and J. von
Buttlar and R. M. {Whalen, Jr.}",
title = "Enhanced {I/O} subsystem recovery and availability on
the {IBM System z9}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "131--144",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/oakes.html",
abstract = "Although part of the IBM System z strategy is to
improve design and development processes to prevent
errors from escaping to the field, improving recovery
is another element in the strategy to keep a machine up
and running should an error occur. The z9e continues on
an evolutionary path of enhancing I/O subsystem (IOSS)
recovery to further advance the reliability,
availability, and serviceability (RAS) of System z
platforms. This paper presents an overview of recovery
and how it interacts with other RAS functions--such as
error-detection mechanisms in hardware, including
automatic identification and recovery of failing
elements--up to the point in time prior to the advent
of the z9. It then presents the innovations to IOSS
recovery and error detection in the z9 that further
improve machine availability. The recovery
infrastructure, which significantly reduces recovery
time and makes recovery much less dependent on machine
scaling for this and future generations of System z
servers, is described. Also described are such
innovative uses of this new infrastructure as
improvements in error detection related to elusive
firmware problems seen in prior machines, the ability
to detect and recover from firmware hangs or lockups
related to inadvertently leaving control blocks locked,
and the capability to perform recovery in parallel by
multiple system- assist processors.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Mueller:2007:FRC,
author = "M. J. Mueller and U. Weiss and T. Webel and L. C.
Alves and W. J. Clarke and M. Strasser and E. Engler
and G. Cautillo and H. Osterndorf and J. Schulze",
title = "Fully redundant clock generation and distribution with
dynamic oscillator switchover",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "145--156",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/mueller.html",
abstract = "This paper describes a fully redundant clock
generation and distribution approach with a fully
dynamic switchover capability and concurrent repair. It
highlights the challenges as the design evolved from a
single source, to a ``cold '' standby backup, and
finally to a fully redundant transparent switchover
with no interruption of the workloads running on an IBM
System z9e. The function split between hardware and the
various levels of firmware is described, including the
methods to determine the defect component in the clock
distribution paths. Finally, we describe the joint
effort with a major chip technology vendor to design
and develop the necessary circuitry, according to the
z9e requirements, for clock synchronization and
switching.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Conklin:2007:RPO,
author = "C. R. Conklin and C. J. Hollenback and C. Mayer and A.
Winter",
title = "Reducing planned outages for book hardware maintenance
with concurrent book replacement",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "157--171",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/conklin.html",
abstract = "The IBM System z9e introduces the enhanced book
availability (EBA) feature to reduce the number of
planned system outages. Included as part of the EBA
feature is the concurrent book replacement (CBR)
function, which allows a single book in a multi- book
server to be concurrently removed from the system in
order for service personnel to perform a repair or to
physically upgrade the hardware on the book. This
repaired or upgraded book is then concurrently replaced
and reintegrated into the server configuration. In this
paper, we describe the benefits that the concurrent
book replacement function offers a customer during a
planned repair or upgrade of the System z9. We also
describe a tool, developed to analyze the server in
order to determine whether the server is ``prepared''
for the concurrent book replacement operation, and we
provide an overview of the actions performed by this
tool. The paper also contains a description of the
concurrent book replacement operation, with an emphasis
on the unique functions developed as part of this
design.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Helmich:2007:RI,
author = "U. Helmich and M. Becht and M. J. Becht and J. R.
Easton and R. K. Errickson and T. Gehrmann and S. G.
Glassen and S. R. Greenspan and F. Koeble and H.
Lehmann and C. Mayer and J. S. Nikfarjam and F. A.
Schumacher and W. Storz",
title = "Redundant {I/O} interconnect",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "173--184",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/helmich.html",
abstract = "The outstanding reliability, availability, and
serviceability (RAS) characteristics of IBM mainframe
computers are among the features that gained the IBM
eServere family its reputation as a leading platform
for business-critical applications. The aim now is to
further improve IBM System z9t RAS by introducing
redundant I/O interconnect (RII) as a building block of
enhanced book availability and recovery scenarios. RII
provides a means of maintaining I/O connectivity during
planned or unplanned outages in a way that is
transparent to the operating system and customer
applications. The mechanism that meets this requirement
is the provision of an alternate path to the I/O cage,
which provides high- bandwidth I/O slots to enable a
higher number of I/O ports per card. This paper
discusses the I/O subsystem hardware and firmware
aspects of RII.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Muehlbach:2007:CDU,
author = "A. Muehlbach and B. D. Valentine and D. Immel and M.
S. Bomar and T. V. Bolan",
title = "Concurrent driver upgrade: Method to eliminate
scheduled system outages for new function releases",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "185--193",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/muehlbach.html",
abstract = "The reliability, availability, and serviceability goal
for an IBM zSeries system is to provide
24-hour-per-day, 365-day-per-year service with reduced
system downtime. The continuous reliable operation rate
has been improved with every new zSeries release by
using error prevention, error detection, error
recovery, and other methods that contribute to avoiding
unplanned interruptions. Until now, planned
downtime--for example, the time needed to upgrade a
zSeries to the next firmware driver--had not yet been
addressed. We developed the concurrent driver upgrade
(CDU) feature so that customers could add new functions
without downtime. It is now possible to upgrade the
zSeries firmware engineering change (EC) driver to the
next EC level without any performance impact during the
upgrade. This paper describes the motivation and
strategy of the CDU and describes its use.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Axnix:2007:OSD,
author = "C. Axnix and T. Hendel and M. Mueller and A. Nu{\~n}ez
Mencias and H. Penner and S. Usenbinz",
title = "Open-standard development environment for {IBM System
z9} host firmware",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "195--205",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/axnix.html",
abstract = "When the PL8 64-bit GNU compiler collection front end
was introduced with the IBM z990 system, it laid the
foundation to move toward an open-standard development
environment for the i390 layer of IBM System z host
firmware. However, when the z990 system was developed,
the proprietary project development library system and
the table of contents object file format for i390 code
were still being used. With the IBM System z9e, we have
moved to a fully open-standard development environment.
This paper describes the steps we took to get there, to
improve code performance, development efficiency, and
regression testing, and to develop base functionality
for important System z9 features such as enhanced
driver maintenance. We also discuss plans to further
enhance the development environment for future
systems.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Theurich:2007:AFV,
author = "K. Theurich and A. Albus and F. Eickhoff and D. Immel
and A. Kohler and E. Lange and J. von Buttlar",
title = "Advanced firmware verification using a code simulator
for the {IBM System z9}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "207--216",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/theurich.html",
abstract = "Our methods for simulating host firmware of the IBM
System z9e facilitated rapid development from first
power-on of the system to achieving a platform with a
functional operating system. Hundreds of code bugs were
eliminated before the code was run on System z9
hardware for the first time. This paper describes the
methods used in host firmware simulation for early and
efficient firmware tests. The central element for
firmware simulation is the Central Electronic Complex
Simulator (CECSIM), which offers new facilities to
manage the hardware of the simulated system. This
management includes concurrent configuration changes of
processors, memory, and I/O along with the ability to
automatically test complex system functions. To verify
correct implementation of the z/Architecture, we
introduced a new test-case framework called the
Verification Interface for System Architecture, or
VISA, which is used in simulations as well as on the
actual system. All of these features are used
separately and in combination. A comprehensive and
flexible regression environment ensures periodic
execution of the test scenarios, and code path coverage
measurements show the degree to which the code was
actually verified.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Duale:2007:DFP,
author = "A. Y. Duale and M. H. Decker and H.-G. Zipperer and M.
Aharoni and T. J. Bohizic",
title = "Decimal floating-point in {z9}: An implementation and
testing perspective",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "217--227",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/rd.511.0217",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/duale.html",
abstract = "Although decimal arithmetic is widely used in
commercial and financial applications, the related
computations are handled in software. As a result,
applications that use decimal data may experience
performance degradations. Use of the newly defined
decimal floating-point (DFP) format instead of binary
floating-point is expected to significantly improve the
performance of such applications. System z9 is the
first IBM machine to support the DFP instructions. We
present an overview of this implementation and provide
some measurement of the performance gained using
hardware assists. Various tools and techniques employed
for the DFP verification on unit, element, and system
levels are presented in detail. Several groups within
IBM collaborated on the verification of the new DFP
facility, using a common reference model to predict DFP
results.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Webb:2007:PSR,
author = "A. M. Webb and R. Mansell and J. W. Knight and S. J.
Greenspan and D. B. Emmes",
title = "Practical software reuse for {IBM System z} {I/O}
subsystems",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "229--243",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/511/webb.html",
abstract = "The design and implementation of the z/VM SCSI (Small
Computer System Interface) I/O subsystem is described.
z/VM is an operating system that provides multiple
virtual IBM System z machines on a single IBM System z
computer. The approach adopted herein allows the reuse
of entire device drivers from AIX 5Le, a completely
different operating system, essentially unchanged. AIX
5L is the IBM UNIX operating system for the IBM System
pe platform. The design, and much of the implemented
code that allows the incorporation of such ``foreign''
device drivers, is independent of both z/VM and AIX 5L
and could potentially be used in other operating system
environments.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Price:2007:MVP,
author = "Cyril Price",
title = "Message from the {Vice President, System z Program
Management, IBM Systems and Technology Group}",
journal = j-IBM-JRD,
volume = "51",
number = "1/2",
pages = "??--??",
month = jan # "\slash " # mar,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Feb 9 20:31:06 MST 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
ordernumber = "????",
}
@Article{Schieber:2007:P,
author = "B. M. Schieber",
title = "Preface",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "247--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gresh:2007:ASC,
author = "D. L. Gresh and D. P. Connors and J. P. Fasano and R.
J. Wittrock",
title = "Applying supply chain optimization techniques to
workforce planning problems",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "251--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/gresh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Naveh:2007:WOI,
author = "Y. Naveh and Y. Richter and Y. Altshuler and D. L.
Gresh and D. P. Connors",
title = "Workforce optimization: {Identification} and
assignment of professional workers using constraint
programming",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "263--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/naveh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hu:2007:SMA,
author = "J. Hu and B. K. Ray and M. Singh",
title = "Statistical methods for automated generation of
service engagement staffing plans",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "281--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/hu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Muller:2007:QOM,
author = "S. M{\"u}ller and C. Supatgiat",
title = "A quantitative optimization model for dynamic
risk-based compliance management",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "295--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/muller.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yashchin:2007:MRL,
author = "E. Yashchin",
title = "Modeling of risk losses using size-biased data",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "309--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/yashchin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vaidyanathan:2007:MNF,
author = "B. Vaidyanathan and K. C. Jha and R. K. Ahuja",
title = "Multicommodity network flow approach to the railroad
crew-scheduling problem",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "325--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/vaidyanathan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dash:2007:PDP,
author = "S. Dash and J. Kalagnanam and C. Reddy and S. H.
Song",
title = "Production design for plate products in the steel
industry",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "345--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/dash.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yanagisawa:2007:MAP,
author = "H. Yanagisawa",
title = "The material allocation problem in the steel
industry",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "363--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/yanagisawa.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Parija:2007:SPP,
author = "G. Parija and T. Kumar and H. Xi and D. Keller",
title = "Strategic planning of preparedness budgets for
wildland fire management",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "375--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/parija.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Barahona:2007:IAT,
author = "F. Barahona and P. Chowdhary and M. Ettl and P. Huang
and T. Kimbrel and L. Ladanyi and Y. M. Lee and B.
Schieber and K. Sourirajan and M. I. Sviridenko and G.
M. Swirszcz",
title = "Inventory allocation and transportation scheduling for
logistics of network-centric military operations",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "391--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/barahona.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Selby:2007:MEO,
author = "D. A. Selby",
title = "Marketing event optimization",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "409--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/selby.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Labbi:2007:OMP,
author = "A. Labbi and C. Berrospi",
title = "Optimizing marketing planning and budgeting using
{Markov} decision processes: an airline case study",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "421--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/labbi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Katircioglu:2007:SBC,
author = "K. Katircioglu and T. M. Brown and M. Asghar",
title = "An {SQL}-based cost-effective inventory optimization
solution",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "433--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/katircioglu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Korevaar:2007:IBO,
author = "P. Korevaar and U. Schimpel and R. Boedi",
title = "Inventory budget optimization: {Meeting} system-wide
service levels in practice",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "447--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/korevaar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:2007:IAR,
author = "G. F. Anderson and D. A. Selby and M. Ramsey",
title = "Insider attack and real-time data mining of user
behavior",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "465--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/anderson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Better:2007:AAI,
author = "M. Better and F. Glover and M. Laguna",
title = "Advances in analytics: {Integrating} dynamic data
mining with simulation optimization",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "477--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/better.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lee:2007:MIN,
author = "J. Lee",
title = "Mixed-integer nonlinear programming: {Some} modeling
and solution issues",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "489--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/lee.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pulleyblank:2007:MVP,
author = "William R. Pulleyblank",
title = "Message from the {Vice President, Center for Business
Optimization}, {IBM} Global Business Services",
journal = j-IBM-JRD,
volume = "51",
number = "3/4",
pages = "??--??",
month = apr # "\slash " # may,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:45 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/513/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hofstee:2007:P,
author = "H. P. Hofstee and A. K. Nandas and J. J. Ritsko and
Editor-in-Chief",
title = "Preface",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "501--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Johns:2007:ICB,
author = "C. R. Johns and D. A. Brokenshire",
title = "Introduction to the {Cell Broadband Engine}
Architecture",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "503--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/johns.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shimizu:2007:CBE,
author = "K. Shimizu and H. P. Hofstee and J. S. Liberty",
title = "{Cell Broadband Engine} processor vault security
architecture",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "521--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/shimizu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Flachs:2007:MIS,
author = "B. Flachs and S. Asano and S. H. Dhong and H. P.
Hofstee and G. Gervais and R. Kim and T. Le and P. Liu
and J. Leenstra and J. S. Liberty and B. Michael and
H.-J. Oh and S. M. Mueller and O. Takahashi and K.
Hirairi and A. Kawasumi and H. Murakami and H. Noro and
S. Onishi and J. Pille and J. Silberman and S. Yong and
A. Hatakeyama and Y. Watanabe and N. Yano and D. A.
Brokenshire and M. Peyravian and V. To and E. Iwata",
title = "Microarchitecture and implementation of the
synergistic processor in 65-nm and 90-nm {SOI}",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "529--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/flachs.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Riley:2007:CBE,
author = "M. W. Riley and J. D. Warnock and D. F. Wendel",
title = "{Cell Broadband Engine} processor: {Design} and
implementation",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "545--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/riley.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:2007:CBE,
author = "T. Chen and R. Raghavan and J. N. Dale and E. Iwata",
title = "{Cell Broadband Engine Architecture} and its first
implementation---{A} performance view",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "559--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/chen.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nanda:2007:CBB,
author = "A. K. Nanda and J. R. Moulic and R. E. Hanson and G.
Goldrian and M. N. Day and B. D. D'Amora and S.
Kesavarapu and Karen A. Magerlein and Atman Binstock
and Bernard Yee and Francesco Iorio",
title = "{Cell\slash B.E.} blades: Building blocks for
scalable, real-time, interactive, and digital media
servers",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "573--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See erratum \cite{Anonymous:2008:E} supplying missing
authors.",
URL = "http://www.research.ibm.com/journal/rd/515/nanda.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Liu:2007:SRS,
author = "Y. Liu and H. Jones and S. Vaidya and M. Perrone and
B. Tydlit{\'a}t and A. K. Nanda",
title = "Speech recognition systems on the {Cell Broadband
Engine} processor",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "583--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/liu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Perez:2007:CMI,
author = "J. M. Perez and P. Bellens and R. M. Badia and J.
Labarta",
title = "{CellSs}: Making it easier to program the {Cell
Broadband Engine} processor",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "593--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/perez.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Black:2007:PSA,
author = "C. T. Black and R. Ruiz and G. Breyta and J. Y. Cheng
and M. E. Colburn and K. W. Guarini and H.-C. Kim and
Y. Zhang",
title = "Polymer self assembly in semiconductor
microelectronics",
journal = j-IBM-JRD,
volume = "51",
number = "5",
pages = "605--??",
month = sep,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 31 11:53:46 MDT 2007",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/515/black.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mehta:2007:P,
author = "H. Mehta",
title = "Preface",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "637--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Le:2007:IPM,
author = "H. Q. Le and W. J. Starke and J. S. Fields and F. P.
O'Connell and D. Q. Nguyen and B. J. Ronchetti and W.
M. Sauer and E. M. Schwarz and M. T. Vaden",
title = "{IBM POWER6} microarchitecture",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "639--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/le.html",
abstract = "This paper describes the implementation of the IBM
POWER6 microprocessor, a two-way simultaneous
multithreaded (SMT) dual-core chip whose key features
include binary compatibility with IBM POWER5
microprocessor-based systems; increased functional
capabilities, such as decimal floating-point and vector
multimedia extensions; significant reliability,
availability, and serviceability enhancements; and
robust scalability with up to 64 physical processors.
Based on a new industry-leading high-frequency core
architecture with enhanced SMT and driven by a
high-throughput symmetric multiprocessing (SMP) cache
and memory subsystem, the POWER6 chip achieves a
significant performance boost compared with its
predecessor, the POWER5 chip. Key extensions to the
coherence protocol enable POWER6 microprocessor-based
systems to achieve better SMP scalability while
enabling reductions in system packaging complexity and
cost.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eisen:2007:IPA,
author = "L. Eisen and J. W. {Ward III} and H.-W. Tast and N.
M{\"a}ding and J. Leenstra and S. M. Mueller and C.
Jacobi and J. Preiss and E. M. Schwarz and S. R.
Carlough",
title = "{IBM POWER6} accelerators: {VMX} and {DFU}",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "663--683",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/eisen.html",
abstract = "The IBM POWER6 microprocessor core includes two
accelerators for increasing performance of specific
workloads. The vector multimedia extension (VMX)
provides a vector acceleration of graphic and
scientific workloads. It provides single instructions
that work on multiple data elements. The instructions
separate a 128-bit vector into different components
that are operated on concurrently. The decimal
floating-point unit (DFU) provides acceleration of
commercial workloads, more specifically, financial
transactions. It provides a new number system that
performs implicit rounding to decimal radix points, a
feature essential to monetary transactions. The IBM
POWER processor instruction set is substantially
expanded with the addition of these two accelerators.
The VMX architecture contains 176 instructions, while
the DFU architecture adds 54 instructions to the base
architecture. The IEEE 754R Binary Floating-Point
Arithmetic Standard defines decimal floating-point
formats, and the POWER6 processor---on which a
substantial amount of area has been devoted to
increasing performance of both scientific and
commercial workloads---is the first commercial hardware
implementation of this format.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "decimal floating-point arithmetic",
}
@Article{Berridge:2007:IPM,
author = "R. Berridge and R. M. {Averill III} and A. E. Barish
and M. A. Bowen and P. J. Camporese and J. DiLullo and
P. E. Dudley and J. Keinert and D. W. Lewis and R. D.
Morel and T. Rosser and N. S. Schwartz and P. Shephard
and H. H. Smith and D. Thomas and P. J. Restle and J.
R. Ripley and S. L. Runyon and P. M. Williams",
title = "{IBM POWER6} microprocessor physical design and design
methodology",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "685--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/berridge.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Curran:2007:PCH,
author = "B. Curran and E. Fluhr and J. Paredes and L. Sigal and
J. Friedrich and Y.-H. Chan and C. Hwang",
title = "Power-constrained high-frequency circuits for the {IBM
POWER6} microprocessor",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "715--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/curran.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Floyd:2007:SPM,
author = "M. S. Floyd and S. Ghiasi and T. W. Keller and K.
Rajamani and F. L. Rawson and J. C. Rubio and M. S.
Ware",
title = "System power management support in the {IBM POWER6}
microprocessor",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "733--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/floyd.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Plass:2007:IPS,
author = "D. W. Plass and Y. H. Chan",
title = "{IBM POWER6 SRAM} arrays",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "747--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/plass.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Armstrong:2007:IPP,
author = "W. J. Armstrong and R. L. Arndt and T. R. Marchini and
N. Nayar and W. M. Sauer",
title = "{IBM POWER6} partition mobility: Moving virtual
servers seamlessly between physical systems",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "757--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/armstrong.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mack:2007:IPR,
author = "M. J. Mack and W. M. Sauer and S. B. Swaney and B. G.
Mealey",
title = "{IBM POWER6} reliability",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "763--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/mack.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McCreary:2007:EIP,
author = "H.-Y. McCreary and M. A. Broyles and M. S. Floyd and
A. J. Geissler and S. P. Hartman and F. L. Rawson and
T. J. Rosedahl and J. C. Rubio and M. S. Ware",
title = "{EnergyScale} for {IBM POWER6} microprocessor-based
systems",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "775--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/516/mccreary.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2007:AIV,
author = "Anonymous",
title = "Author index for Volume 51",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "787--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2007:SIV,
author = "Anonymous",
title = "Subject index for Volume 51",
journal = j-IBM-JRD,
volume = "51",
number = "6",
pages = "795--??",
month = nov,
year = "2007",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mintzer:2008:P,
author = "F. Mintzer",
title = "Preface",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "3--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Raman:2008:ARP,
author = "S. Raman and B. Qian and D. Baker and R. C. Walker",
title = "Advances in {Rosetta} protein structure prediction on
massively parallel systems",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "7--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/raman.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zhou:2008:MPM,
author = "R. Zhou and M. Eleftheriou and C.-C. Hon and R. S.
Germain and A. K. Royyuru and B. J. Berne",
title = "Massively parallel molecular dynamics simulations of
lysozyme unfolding",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "19--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/zhou.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Djurfeldt:2008:BSS,
author = "M. Djurfeldt and M. Lundqvist and C. Johansson and M.
Rehn and {\"O}. Ekeberg and A. Lansner",
title = "Brain-scale simulation of the neocortex on the {IBM
Blue Gene/L} supercomputer",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "31--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/djurfeldt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kozloski:2008:ITA,
author = "J. Kozloski and K. Sfyrakis and S. Hill and F.
Sch{\"u}rmann and C. Peck and H. Markram",
title = "Identifying, tabulating, and analyzing contacts
between branched neuron morphologies",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "43--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/kozloski.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shave:2008:LDM,
author = "S. R. Shave and P. Taylor and M. Walkinshaw and L.
Smith and J. Hardy and A. Trew",
title = "Ligand discovery on massively parallel systems",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "57--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/shave.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pang:2008:EIB,
author = "Y.-P. Pang and T. J. Mullins and B. A. Swartz and J.
S. McAllister and B. E. Smith and C. J. Archer and R.
G. Musselman and A. E. Peters and B. P. Wallenfelt and
K. W. Pinnow",
title = "{EUDOC} on the {IBM Blue Gene/L} system: Accelerating
the transfer of drug discoveries from laboratory to
patient",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "69--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/pang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Calandra:2008:MPI,
author = "H. Calandra and F. Bothorel and P. Vezolle",
title = "A massively parallel implementation of the common
azimuth pre-stack depth migration",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "83--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/calandra.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Commer:2008:MPE,
author = "M. Commer and G. A. Newman and J. J. Carazzone and T.
A. Dickens and K. E. Green and L. A. Wahrmund and D. E.
Willen and J. Shiu",
title = "Massively parallel electrical-conductivity imaging of
hydrocarbons using the {IBM Blue Gene/L}
supercomputer",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "93--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/commer.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ethier:2008:LSG,
author = "S. Ethier and W. M. Tang and R. Walkup and L. Oliker",
title = "Large-scale gyrokinetic particle simulation of
microturbulence in magnetically confined fusion
plasmas",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "105--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/ethier.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dennis:2008:SCS,
author = "J. M. Dennis and H. M. Tufo",
title = "Scaling climate simulation applications on the {IBM
Blue Gene/L} system",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "117--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/dennis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fisher:2008:TTC,
author = "R. T. Fisher and L. P. Kadanoff and D. Q. Lamb and A.
Dubey and T. Plewa and A. Calder and F. Cattaneo and P.
Constantin and I. Foster and M. E. Papka and S. I.
Abarzhi and S. M. Asida and P. M. Rich and C. C.
Glendenin and K. Antypas and D. J. Sheeler and L. B.
Reid and B. Gallagher and S. G. Needham",
title = "Terascale turbulence computation using the {FLASH3}
application framework on the {IBM Blue Gene/L} system",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "127--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/fisher.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gygi:2008:AQS,
author = "F. Gygi",
title = "Architecture of {Qbox}: a scalable first-principles
molecular dynamics code",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "137--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/gygi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fitch:2008:BMS,
author = "B. G. Fitch and A. Rayshubskiy and M. Eleftheriou and
T. J. C. Ward and M. E. Giampapa and M. C. Pitman and
J. W. Pitera and W. C. Swope and R. S. Germain",
title = "{Blue Matter}: Scaling of {$N$}-body simulations to
one atom per node",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "145--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/fitch.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "fast multipole",
}
@Article{Bohm:2008:FGP,
author = "E. Bohm and A. Bhatele and L. V. Kal{\'e} and M. E.
Tuckerman and S. Kumar and J. A. Gunnels and G. J.
Martyna",
title = "Fine-grained parallelization of the {Car--Parrinello}
ab initio molecular dynamics method on the {IBM Blue
Gene/L} supercomputer",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "159--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/bohm.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kumar:2008:SMD,
author = "S. Kumar and C. Huang and G. Zheng and E. Bohm and A.
Bhatele and J. C. Phillips and H. Yu and L. V.
Kal{\'e}",
title = "Scalable molecular dynamics with {NAMD} on the {IBM
Blue Gene/L} system",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "177--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/kumar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vranas:2008:MPQ,
author = "P. Vranas and M. A. Blumrich and D. Chen and A. Gara
and M. E. Giampapa and P. Heidelberger and V. Salapura
and J. C. Sexton and R. Soltz and G. Bhanot",
title = "Massively parallel quantum chromodynamics",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "189--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/vranas.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{IBGT:2008:OIB,
author = "{IBM Blue Gene team}",
title = "Overview of the {IBM Blue Gene/P Project}",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "199--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/team.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Agerwala:2008:MVP,
author = "Tilak Agerwala",
title = "Message from the {Vice President, Systems, IBM
Research Division}",
journal = j-IBM-JRD,
volume = "52",
number = "1/2",
pages = "??--??",
month = jan # "\slash " # mar,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/521/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Heidel:2008:P,
author = "D. F. Heidel and J. Hergenrother and K. P. Rodbells",
title = "Preface",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "223--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Heidel:2008:API,
author = "D. F. Heidel and K. P. Rodbell and E. H. Cannon and C.
{Cabral, Jr.} and M. S. Gordon and P. Oldiges and H. H.
K. Tang",
title = "Alpha-particle-induced upsets in advanced {CMOS}
circuits and technology",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "225--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/heidel.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tang:2008:SNG,
author = "H. H. K. Tang",
title = "{SEMM-2}: a new generation of single-event-effect
modeling tools",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "233--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/tang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tang:2008:NSM,
author = "H. H. K. Tang and C. E. Murray and G. Fiorenza and K.
P. Rodbell and M. S. Gordon and D. F. Heidel",
title = "New simulation methodology for effects of radiation in
semiconductor chip structures",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "245--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/murray.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{KleinOsowski:2008:CDM,
author = "A. KleinOsowski and E. H. Cannon and P. Oldiges and L.
Wissel",
title = "Circuit design and modeling for soft errors",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "255--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/kleinosowski.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gordon:2008:SEU,
author = "M. S. Gordon and K. P. Rodbell and D. F. Heidel and C.
{Cabral, Jr.} and E. H. Cannon and D. D. Reinhardt",
title = "Single-event-upset and alpha-particle emission rate
measurement techniques",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "265--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/gordon.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanda:2008:SER,
author = "P. N. Sanda and J. W. Kellington and P. Kudva and R.
Kalla and R. B. McBeth and J. Ackaret and R. Lockwood
and J. Schumann and C. R. Jones",
title = "Soft-error resilience of the {IBM POWER6} processor",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "275--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/sanda.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bender:2008:SER,
author = "C. Bender and P. N. Sanda and P. Kudva and R. Mata and
V. Pokala and R. Haraden and M. Schallhorn",
title = "Soft-error resilience of the {IBM POWER6} processor
input\slash output subsystem",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "285--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/bender.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rivers:2008:PPM,
author = "J. A. Rivers and P. Bose and P. Kudva and J.-D.
Wellman and P. N. Sanda and E. H. Cannon and L. C.
Alves",
title = "{Phaser}: Phased methodology for modeling the
system-level effects of soft errors",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "293--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/rivers.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dell:2008:SRI,
author = "T. J. Dell",
title = "System {RAS} implications of {DRAM} soft errors",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "307--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/dell.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:2008:MVP,
author = "T.-C. Chen",
title = "Message from the {Vice President, Science and
Technology, IBM Research Division}",
journal = j-IBM-JRD,
volume = "52",
number = "3",
pages = "??--??",
month = apr # "\slash " # may,
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jul 7 21:49:07 MDT 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/523/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kandlur:2008:P,
author = "Dilip D. Kandlur and Chandrasekhar (Spike) Narayan",
title = "Preface",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "317--318",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Oehme:2008:ISF,
author = "Sven Oehme and Juergen Deicke and Jens-Peter Akelbein
and Ronnie Sahlberg and Andred Tridgell and Roger L.
Haskin",
title = "{IBM Scale out File Services}: Reinventing
network-attached storage",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "319--328",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/oehme.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lanjewar:2008:GAF,
author = "Ujjwal Lanjewar and Manoj Naik and Renu Tewari",
title = "{Glamor}: An architecture for file system federation",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "329--339",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/lanjewar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gopisetty:2008:ESM,
author = "Sandeep Gopisetty and Sandip Agarwala and Eric Butler
and Divyesh Jadav and Stefan Jaquet and Madhukar
Korupolu and Ramani Routray and Prasenjit Sarkar and
Aameek Singh and Miriam Sivan-Zimet and Chung-Hao Tan
and Sandeep Uttamchandani and David Merbach and Sumant
Padbidri and Andreas Dieberger and Eben M. Haber and
Eser Kandogan and Cheryl A. Kieliszewski and Dakshi
Agrawal and Murthy Devarakonda and Kang-Wong Lee and
Kostas Magoutis and Dinesh C. Verma and Norbert G.
Vogl",
title = "Evolution of storage management: Transforming raw data
into information",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "341--352",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/gopisetty.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gopisetty:2008:APS,
author = "Sandeep Gopisetty and Eric Butler and Stefan Jaquet
and Madhukar Korupolu and Tapan K. Nayak and Ramani
Routray and Mark Seaman and Aameek Singh and Chung-Hao
Tan and Sandeep Uttamchandani and Akshat Verma",
title = "Automated planners for storage provisioning and
disaster recovery",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "353--365",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/butler.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Magoutis:2008:GMD,
author = "Kostas Magoutis and Murthy Devarakonda and Nikolai
Joukov and Norbert G. Vogl",
title = "{Galapagos}: Model-driven discovery of end-to-end
application--storage relationships in distributed
systems",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "367--377",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/magoutis.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bradshaw:2008:ASS,
author = "Paul L. Bradshaw and Karen W. Brannon and Thomas Clark
and Kirby Dahman and Sangeeta Doraiswamy and Linda
Duyanovich and Bruce L. Hillsberg and Wayne Hineman and
Michael Kaczmarski and Bernhard J. (BJ) Klingenberg and
Xiaonan Ma and Robert Rees",
title = "Archive storage system design for long-term storage of
massive amounts of data",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "379--388",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/bradshaw.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rabinovici-Cohen:2008:PDN,
author = "Simona Rabinovici-Cohen and Michael E. Factor and
Dalit Naor and Leeat Ramati and Petra Reshef and Shahar
Ronen and Julian Satran and David L. Giaretta",
title = "{Preservation DataStores}: New storage paradigm for
preservation environments",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "389--399",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/rabinovici.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nagle:2008:ATO,
author = "David Nagle and Michael E. Factor and Sami Iren and
Dalit Naor and Erik Riedel and Ohad Rodeh and Julian
Satran",
title = "The {ANSI T10} object-based storage standard and
current implementations",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "401--411",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/nagle.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hafner:2008:UDE,
author = "James L. Hafner and Veera Deenadhayalan and Wendy
Belluomini and Krishnakumar Rao",
title = "Undetected disk errors in {RAID} arrays",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "413--425",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/hafner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chambliss:2008:ASH,
author = "David Chambliss and Prashant Pandey and Tarun Thakur
and Aki Fleshler and Thomas Clark and James A. Ruddy
and Kevin D. Gougherty and Matt Kalos and Lyle Merithew
and John G. Thompson and Harry M. Yudenfriend",
title = "An architecture for storage-hosted application
extensions",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "427--437",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/chambliss.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Freitas:2008:SCM,
author = "Richard F. Freitas and Winfried W. Wilcke",
title = "Storage-class memory: The next storage system
technology",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "439--447",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/freitas.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Burr:2008:OCD,
author = "Geoffrey W. Burr and B{\"u}lent N. Kurdi and J.
Campbell Scott and Chung H. Lam and Kailash
Gopalakrishnan and Rohit S. Shenoy",
title = "Overview of candidate device technologies for
storage-class memory",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "449--464",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/burr.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Raoux:2008:PCR,
author = "Simone Raoux and Geoffrey W. Burr and Matthew J.
Breitwisch and Charles T. Rettner and Yi-Chou Chen and
Robert M. Shelby and Martin Salinga and Daniel Krebs
and Shih-Hung Chen and Hsiang-Lan Lung and Chung H.
Lam",
title = "Phase-change random access memory: a scalable
technology",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "465--479",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/raoux.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Karg:2008:TMO,
author = "Siegfried F. Karg and G. Ingmar Meijer and J. Georg
Bednorz and Charles T. Rettner and Alejandro G. Schrott
and Eric A. Joseph and Chung H. Lam and Markus Janousch
and Urs Staub and Fabio {La Mattina} and Santos F.
Alvarado and Daniel Widmer and Richard Stutz and Ute
Drechsler and Daniele Caimi",
title = "Transition-metal-oxide-based resistance-change
memories",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "481--492",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/karg.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pantazi:2008:PBU,
author = "A. Pantazi and A. Sebastian and T. A. Antonakopoulos
and P. B{\"a}chtold and A. R. Bonaccio and J. Bonan and
G. Cherubini and M. Despont and R. A. DiPietro and U.
Drechsler and U. D{\"u}rig and B. Gotsmann and W.
H{\"a}berle and C. Hagleitner and J. L. Hedrick and D.
Jubin and A. Knoll and M. A. Lantz and J. Pentarakis
and H. Pozidis and R. C. Pratt and H. Rothuizen and R.
Stutz and M. Varsamou and D. Wiesmann and E.
Eleftheriou",
title = "Probe-based ultrahigh-density storage technology",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "493--511",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/pantazi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Argumedo:2008:STR,
author = "Armando J. Argumedo and David Berman and Robert G.
Biskeborn and Giovanni Cherubini and Roy D. Cideciyan
and Evangelos Eleftheriou and Walter H{\"a}berle and
Diana J. Hellman and Robert Hutchins and Wayne Imaino
and Jens Jelitto and Kevin Judd and Pierre-Olivier
Jubert and Mark A. Lantz and Gary M. McClelland and
Thomas Mittelholzer and Chandrasekhar (Spike) Narayan
and Sedat {\"O}l{\c{c}}er and Paul J. Seger",
title = "Scaling tape-recording areal densities to {100
Gb/in$^2$}",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "513--527",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/argumedo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lai:2008:FMS,
author = "Stefan K. Lai",
title = "Flash memories: Successes and challenges",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "529--435",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/lai.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dean:2008:MVP,
author = "Mark E. Dean and Barry Rudolph",
title = "Message from the {Vice President, Technical Strategy
and Global Operations, IBM Research} and the {Vice
President, System Storage, IBM Systems and Technology
Group}",
journal = j-IBM-JRD,
volume = "52",
number = "4/5",
pages = "",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/524/message.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Knickerbocker:2008:P,
author = "John U. Knickerbocker",
title = "Preface",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "539--540",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Emma:2008:CTN,
author = "Philip G. Emma and Eren Kursun",
title = "Is {$3$D} chip technology the next growth engine for
performance improvement?",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "541--552",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/emma.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Knickerbocker:2008:TDS,
author = "John U. Knickerbocker and Paul S. Andry and Bing Dang
and Raymond R. Horton and Mario J. Interrante and
Chirag S. Patel and Robert J. Polastre and Katsuyuki
Sakuma and Ranjani Sirdeshmukh and Edmund J. Sprogis
and Sri M. Sri-Jayantha and Antonio M. Stephens and
Anna W. Topol and Cornelia K. Tsang and Bucknell C.
Webb and Steven L. Wright",
title = "Three-dimensional silicon integration",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "553--569",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/knickerbocker.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andry:2008:FCR,
author = "Paul S. Andry and Cornelia K. Tsang and Bucknell C.
Webb and Edmund J. Sprogis and Steven L. Wright and
Bing Dang and Dennis G. Manzer",
title = "Fabrication and characterization of robust
through-silicon vias for silicon-carrier applications",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "571--581",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/andry.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koester:2008:WLI,
author = "Steven J. Koester and Albert M. Young and Roy R. Yu
and Sampath Purushothaman and Kuan-Neng Chen and
Douglas C. {La Tulipe, Jr.} and Narender Rana and
Leathen Shi and Matthew R. Wordeman and Edmund J.
Sprogis",
title = "Wafer-level {$3$D} integration technology",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "583--597",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/koester.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dang:2008:CSC,
author = "Bing Dang and Steven L. Wright and Paul S. Andry and
Edmund J. Sprogis and Cornelia K. Tsang and Mario J.
Interrante and Bucknell C. Webb and Robert J. Polastre
and Raymond R. Horton and Chirag S. Patel and Arun
Sharma and Jiantao Zheng and Katsuyuki Sakuma and John
U. Knickerbocker",
title = "{$3$D} chip stacking with {C4} technology",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "599--609",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/dang.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sakuma:2008:CST,
author = "Katsuyuki Sakuma and Paul S. Andry and Cornelia K.
Tsang and Steven L. Wright and Bing Dang and Chirag S.
Patel and Bucknell C. Webb and Joana Maria and Edmund
J. Sprogis and Sung K. Kang and Robert J. Polastre and
Raymond R. Horton and John U. Knickerbocker",
title = "{$3$D} chip-stacking technology with through-silicon
vias and low-volume lead-free interconnections",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "611--622",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/sakuma.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sri-Jayantha:2008:TME,
author = "Sri M. Sri-Jayantha and Gerard McVicker and Kerry
Bernstein and John U. Knickerbocker",
title = "Thermomechanical modeling of {$3$D} electronic
packages",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "623--634",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/sri-jayantha.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Joseph:2008:TSV,
author = "Alvin J. Joseph and John D. Gillis and Mark Doherty
and Peter J. Lindgren and Rosemary A. Previti-Kelly and
Ramana M. Malladi and Ping-Chuan Wang and Mete Erturk
and Hanyi Ding and Ephrem G. Gebreselasie and Michael
J. McPartlin and James Dunn",
title = "Through-silicon vias enable next-generation {SiGe}
power amplifiers for wireless communications",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "635--648",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/joseph.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2008:AIV,
author = "Anonymous",
title = "Author index for Volume 52",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "649--655",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/authv52.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2008:SIV,
author = "Anonymous",
title = "Subject index for Volume 52",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "657--661",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/526/subjv52.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2008:E,
author = "Anonymous",
title = "Erratum",
journal = j-IBM-JRD,
volume = "52",
number = "6",
pages = "663--663",
month = "????",
year = "2008",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Nov 26 16:33:43 MST 2008",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
note = "See \cite{Nanda:2007:CBB}.",
URL = "http://www.research.ibm.com/journal/rd/526/erratum.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McPherson:2009:P,
author = "Tom McPherson and Robert Wallners",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "i--i",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/preface.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Price:2009:MVP,
author = "Cyril Price and Carla Shultis",
title = "Message from the {Vice President, System Z Program
Management} and the {Vice President, System Z Operating
System Development}",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "1--3",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/message.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shum:2009:DMI,
author = "C.-L. K. Shum and F. Busaba and S. Dao-Trong and G.
Gerwig and C. Jacobi and T. Koehler and E. Pfeffer and
B. R. Prasky and J. G. Rell and A. Tsai",
title = "Design and microarchitecture of the {IBM System z10}
microprocessor",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "1:1--1:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/shum.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mak:2009:ISZ,
author = "P. Mak and C. R. Walters and G. E. Strait",
title = "{IBM System z10} processor cache subsystem
microarchitecture",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "2:1--2:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/mak.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Krygowski:2009:FVI,
author = "C. A. Krygowski and D. G. Bair and R. M. Gott and M.
H. Decker and A. V. Giri and C. Habermann and M.
Heizmann and S. Letz and W. J. Lewis and S. M. Licker
and H. Mallar and E. C. McCain and W. Roesner and N.
Siddique and A. E. Seigler and B. W. Thompto and K.
Weber and R. Winkelmann",
title = "Functional verification of the {IBM System z10}
processor chipset",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "3:1--3:11",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/krygowski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schwarz:2009:DFP,
author = "E. M. Schwarz and J. S. Kapernick and M. F.
Cowlishaw",
title = "Decimal floating-point support on the {IBM System z10}
processor",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "4:1--4:10",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/schwarz.pdf",
abstract = "The latest IBM zSeries processor, the IBM System z10
processor, provides hardware support for the decimal
floating-point (DFP) facility that was introduced on
the IBM System z9 processor. The z9 processor
implements the facility with a mixture of low-level
software and hardware assists. Recently, the IBM POWER6
processor-based System p 570 server introduced a
hardware implementation of the DFP facility. The latest
zSeries processor includes a decimal floating-point
unit based on the POWER6 processor DFP unit that has
been enhanced to also support the traditional zSeries
decimal fixed-point instruction set. This paper
explains the hardware implementation to support both
decimal fixed point and DFP and the new software
support for the DFP facility, including IBM z/OS, Java
JIT, and C/C++ compilers, as well as support in IBM DB2
and middleware.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Salem:2009:SFT,
author = "G. Salem and D. W. Wittig and T. G. Foote and B. J.
Robbins and C. Hirko and D. O. Forlenza and F. Motika
and J. A. Kyle and M. P. Kusko and O. P. Forlenza and
R. J. Frishmuth and R. Yaari and S. Michnowski and U.
Baur",
title = "Structural and functional test of {IBM System z10}
chips",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "5:1--5:11",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/salem.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chencinski:2009:ISZ,
author = "E. W. Chencinski and M. A. Check and C. DeCusatis and
H. Deng and M. Grassi and T. A. Gregg and M. M. Helms
and A. D. Koenig and L. Mohr and K. Pandey and T.
Schlipf and T. Schober and H. Ulrich and C. R.
Walters",
title = "{IBM System z10} {I/O} subsystem",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "6:1--6:13",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/chencinski.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schlipf:2009:DVI,
author = "T. Schlipf and M. M. Helms and J. Ruf and M. Klein and
R. Dorsch and B. Hoppe and W. Lipponer and S. Boekholt
and T. R{\"o}wer and M. Walz and S. Junghans",
title = "Design and verification of the {IBM System z10} {I/O}
subsystem chips",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "7:1--7:11",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/schlipf.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haynie:2009:ISZ,
author = "H. M. Haynie and J. M. Turner and J. C. Hanscom and M.
{Cadigan, Jr.} and N. Hadzic and D. Di Genova and J.
Aylward and S. W. Salisbury and P. Sciuto and T. D.
Needham and C. E. Bubb and R. B. Tremaine",
title = "{IBM System z10} Open Systems Adapter {Ethernet} data
router",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "8:1--8:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/haynie.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Torok:2009:PDI,
author = "J. G. Torok and F. E. Bosco and W. L. Brodsky and E.
F. Furey and G. F. Goth and D. J. Kearney and J. J.
Loparco and M. T. Peets and K. L. Pizzolato and D. W.
Porter and G. Ruehle and W. H. White",
title = "Packaging design of the {IBM System z10} Enterprise
Class platform central electronic complex",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "9:1--9:15",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/torok.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Winkel:2009:PDC,
author = "T.-M. Winkel and H. Harrer and D. Kaller and J. Supper
and D. M. Dreps and K. L. Christian and D. Cosmadelis
and T. Zhou and T. Strach and J. Ludwig and D. L.
Edwards",
title = "Packaging design challenges of the {IBM System z10}
Enterprise Class server",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "10:1--10:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/winkel.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Clarke:2009:ISZ,
author = "W. J. Clarke and L. C. Alves and T. J. Dell and H.
Elfering and J. P. Kubala and C. Lin and M. J. Mueller
and K. Werner",
title = "{IBM System z10} design for {RAS}",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "11:1--11:13",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/clarke.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koerner:2009:ISZ,
author = "S. Koerner and A. Kohler and J. Babinsky and H. Pape
and F. Eickhoff and S. Kriese and H. Elfering",
title = "{IBM System z10} firmware simulation",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "12:1--12:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/koerner.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mathias:2009:ACI,
author = "T. B. Mathias and P. J. Callaghan",
title = "Autonomic computing and {IBM System z10} active
resource monitoring",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "13:1--13:11",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/mathias.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bieswanger:2009:PTM,
author = "A. Bieswanger and M. Andres and J. J. {Van Heuklon}
and T. B. Mathias and H. Osterndorf and S. A. Piper and
M. R. Vanderwiel",
title = "Power and thermal monitoring for the {IBM System
z10}",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "14:9--14:9",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/bieswanger.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Axnix:2009:CDA,
author = "C. Axnix and J. R. Birtles and M. Groetzner and F.
Hardt and K.-J. Kuehl and V. M. Lourenco and C. Mayer
and J. Probst and H. Sinram and M. Stock and B. D.
Valentine",
title = "Capacity on Demand advancements on the {IBM System
z10}",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "15:1--15:12",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/axnix.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jackson:2009:ISZ,
author = "K. M. Jackson and M. A. Wisniewski and D. Schmidt and
U. Hild and S. Heisig and P. C. Yeh and W. Gellerich",
title = "{IBM System z10} performance improvements with
software and hardware synergy",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "16:1--16:8",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/jackson.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tzortzatos:2009:ISZ,
author = "E. Tzortzatos and J. Bartik and P. Sutton",
title = "{IBM System z10} support for large pages",
journal = j-IBM-JRD,
volume = "53",
number = "1",
pages = "17:1--17:8",
month = jan # "\slash " # feb,
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 14:25:32 MST 2009",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/rd/531/tzortzatos.pdf",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bertino:2009:APS,
author = "E. Bertino and C. Brodie and S. B. Calo and L. F.
Cranor and C. Karat and J. Karat and N. Li and D. Lin
and J. Lobo and Q. Ni and P. R. Rao and X. Wang",
title = "Analysis of privacy and security policies",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/bertino.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Birman:2009:P,
author = "Alex Birman and John J. Ritsko",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chapin:2009:TPW,
author = "D. A. Chapin and A. C. Nelson and B. S. Gerber",
title = "A technology perspective on worldwide privacy
regulations",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/chapin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hennessy:2009:DCS,
author = "S. D. Hennessy and G. D. Lauer and N. Zunic and B.
Gerber and A. C. Nelson",
title = "Data-centric security: Integrating data privacy and
data security",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/hennessy.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Karat:2009:PFS,
author = "J. Karat and C.-M. Karat and E. Bertino and N. Li and
Q. Ni and C. Brodie and J. Lobo and S. B. Calo and L.
F. Cranor and P. Kumaraguru and R. W. Reeder",
title = "Policy framework for security and privacy management",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/karat.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Karger:2009:PES,
author = "P. A. Karger and G. S. Kc and D. C. Toll",
title = "Privacy is essential for secure mobile devices",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/karger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pearson:2009:MVP,
author = "Harriet P. Pearson",
title = "Message from the {Vice President, Regulatory Policy
{\&} Chief Privacy Officer}",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/letter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pfleeger:2009:HPS,
author = "S. L. Pfleeger and C. P. Pfleeger",
title = "Harmonizing privacy with security principles and
practices",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/pfleeger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Renegar:2009:PVC,
author = "B. D. Renegar and K. Michael",
title = "Privacy-value-control harmonization for {RFID}
adoption in retail",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/renegar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seshadri:2009:RSR,
author = "S. Seshadri and L. Liu and L. Chiu",
title = "Recovery scopes, recovery groups, and fine-grained
recovery in enterprise storage controllers with
multi-core processors",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/seshadri.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Viecco:2009:PAA,
author = "C. Viecco and A. Tsow and L. J. Camp",
title = "A privacy-aware architecture for a {Web} rating
system",
journal = j-IBM-JRD,
volume = "53",
number = "2",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/532/viecco.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Brunschwiler:2009:TZE,
author = "T. Brunschwiler and B. Smith and E. Ruetsche and B.
Michel",
title = "Toward zero-emission data centers through direct reuse
of thermal energy",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/brunschwiler.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "11",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bunn:2009:EEB,
author = "S. M. Bunn and L. Reynolds",
title = "The energy-efficiency benefits of pump-scheduling
optimization for potable water supplies",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/bunn.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen-Ritzo:2009:IP,
author = "C.-H. Chen-Ritzo and C. Harrison and J. Paraszczak and
F. Parr",
title = "Instrumenting the planet",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/chen-ritzo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eckman:2009:ISQ,
author = "B. Eckman and P. C. West and C. Barford and G. Raber",
title = "Intuitive simulation, querying, and visualization for
river basin policy and management",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/eckman.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hamann:2009:UEE,
author = "H. F. Hamann and T. G. van Kessel and M. Iyengar and
J.-Y. Chung and W. Hirt and M. A. Schappert and A.
Claassen and J. M. Cook and W. Min and Y. Amemiya and
V. L{\'o}pez and J. A. Lacey and M. O'Boyle",
title = "Uncovering energy-efficiency opportunities in data
centers",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/hamann.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "10",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kolar:2009:CRT,
author = "H. R. Kolar and J. Cronin and P. Hartswick and A. C.
Sanderson and J. S. Bonner and L. Hotaling and R. F.
Ambrosio and Z. Liu and M. L. Passow and M. L. Reath",
title = "Complex real-time environmental monitoring of the
{Hudson River} and estuary system",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/kolar.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nunes:2009:MVP,
author = "Sharon Nunes",
title = "Message from the {Vice President, Strategic Growth
Initiatives, Big Green Innovations, {IBM} Systems {\&}
Technology Group}",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/letter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{OHare:2009:AED,
author = "G. M. P. O'Hare and D. Diamond and K. T. Lau and J.
Hayes and C. Muldoon and M. J. O'Grady and R. Tynan and
G. Rancourt and H. R. Kolar and R. J. McCarthy",
title = "The adaptive environment: Delivering the vision of in
situ real-time environmental monitoring",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/ohare.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Olson:2009:GST,
author = "E. G. Olson and N. Brady",
title = "{Green Sigma} and the technology of transformation for
environmental stewardship",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/olson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reason:2009:AIF,
author = "J. M. Reason and R. Crepaldi",
title = "Ambient intelligence for freight railroads",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/reason.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schmidt:2009:TIT,
author = "R. Schmidt and M. Iyengar",
title = "Thermodynamics of information technology data
centers",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/schmidt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sourirajan:2009:CMA,
author = "K. Sourirajan and P. Centonze and M. E. Helander and
K. Katircioglu and M. Ben-Hamida and C. Boucher",
title = "Carbon management in assembly manufacturing
logistics",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/sourirajan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Srinivasan:2009:TIW,
author = "K. Srinivasan and S. Goyal and T. Siegmund and G.
Subbarayan and Q. Lin",
title = "Thermally induced wrinkling in thin-film stacks on
patterned substrates",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/srinivasan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "12",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Williams:2009:P,
author = "R. Peter Williams",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "3",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:13 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/533/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Adeshiyan:2009:UVH,
author = "T. Adeshiyan and C. R. Attanasio and E. M. Farr and R.
E. Harper and D. Pelleg and C. Schulz and L. F.
Spainhower and P. Ta-Shma and L. A. Tomek",
title = "Using virtualization for high availability and
disaster recovery",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/adeshiyan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Appavoo:2009:KEC,
author = "J. Appavoo and V. Uhlig and A. Waterland and B.
Rosenburg and D. Da Silva and J. E. Moreira",
title = "{Kittyhawk}: Enabling cooperation and competition in a
global, shared computational system",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/appavoo.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berger:2009:SCI,
author = "S. Berger and R. C{\'a}ceres and K. Goldman and D.
Pendarakis and R. Perez and J. R. Rao and E. Rom and R.
Sailer and W. Schildhauer and D. Srinivasan and S. Tal
and E. Valdez",
title = "Security for the cloud infrastructure: Trusted virtual
data center implementation",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/berger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Breiter:2009:LCC,
author = "G. Breiter and M. Behrendt",
title = "Life cycle and characteristics of services in the
world of cloud computing",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/breiter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jin:2009:RVA,
author = "X. Jin and R. Willenborg and Y. Zhao and C. Sun and L.
He and Z. Chen and Y. Chen and Q. Wang",
title = "Reinventing virtual appliances",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/jin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Naghshineh:2009:IRD,
author = "M. Naghshineh and R. Ratnaparkhi and D. Dillenberger
and J. R. Doran and C. Dorai and L. Anderson and G.
Pacifici and J. L. Snowdon and A. Azagury and M.
VanderWiele and Y. Wolfsthal",
title = "{IBM Research Division} cloud computing initiative",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/naghshineh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Neogi:2009:BFB,
author = "A. Neogi and A. Mohindra and B. Viswanathan and T.
Kushida and H. Horii",
title = "{BlueStar}: a federation-based approach to building
{Internet}-scale data centers",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/neogi.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rochwerger:2009:RMA,
author = "B. Rochwerger and D. Breitgand and E. Levy and A.
Galis and K. Nagin and I. M. Llorente and R. Montero
and Y. Wolfsthal and E. Elmroth and J. C{\'a}ceres and
M. Ben-Yehuda and W. Emmerich and F. Gal{\'a}n",
title = "The {Reservoir} model and architecture for open
federated cloud computing",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/rochwerger.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Silva:2009:SDC,
author = "M. Silva and M. Banikazemi and M. Butrico and D. Daly
and S. Guthridge and J. E. Moreira and W. V. Ruggiero",
title = "Scalable data center provisioning and control",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/silva.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "10",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:2009:P,
author = "T. Basil Smith and M. Naghshineh and N. Bowen and P.
Gupta and K. Schultzs",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vouk:2009:UVT,
author = "M. A. Vouk and A. Rindos and S. F. Averitt and J. Bass
and M. Bugaev and A. Kurth and A. Peeler and H. E.
Schaffer and E. D. Sills and S. Stein and J. Thompson
and M. Valenzisi",
title = "Using {VCL} technology to implement distributed
reconfigurable data centers and computational services
for educational institutions",
journal = j-IBM-JRD,
volume = "53",
number = "4",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/534/vouk.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Biberstein:2009:CBE,
author = "M. Biberstein and S. Dori-Hacohen and Y. Harel and A.
Heilper and B. Mendelson and U. Shvadron and E.
Treister and J. Turek and M. S. Chang",
title = "{Cell Broadband Engine} processor performance
optimization: Tracing tools implementation and use",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/biberstein.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cohen:2009:AAO,
author = "D. Cohen and F. Petrini and M. D. Day and M.
Ben-Yehuda and S. W. Hunter and U. Cummings",
title = "Applying {Amdahl's Other Law} to the data center",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/cohen-hunter.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Crawford:2009:SAS,
author = "C. H. Crawford and D. J. Burdick and J. N. Dale and E.
F. Ford and R. A. Mikosh and A. Nobles and V. To",
title = "Software architecture and system validation of an
open, unified model for accelerated multicore
computing",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/crawford.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Grice:2009:BPB,
author = "D. Grice and H. Brandt and C. Wright and P. McCarthy
and A. Emerich and T. Schimke and C. Archer and J.
Carey and P. Sanders and J. A. Fritzjunker and S. Lewis
and P. Germann",
title = "Breaking the petaflops barrier",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/grice.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gschwind:2009:IEP,
author = "M. Gschwind",
title = "Integrated execution: a programming model for
accelerators",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/gschwind.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gschwind:2009:P,
author = "M. Gschwind and M. Perrones",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kistler:2009:PLB,
author = "M. Kistler and J. Gunnels and D. Brokenshire and B.
Benton",
title = "Programming the {Linpack} benchmark for {Roadrunner}",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/kistler.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pakin:2009:RAM,
author = "S. Pakin and M. Lang and D. J. Kerbyson",
title = "The reverse-acceleration model for programming
petascale hybrid systems",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/pakin-kerbyson.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Penner:2009:DHS,
author = "H. Penner and U. Bacher and J. Kunigk and C. Rund and
H. J. Schick",
title = "{directCell}: Hybrid systems with tightly coupled
accelerators",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/penner.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rohrer:2009:ANR,
author = "J. Rohrer and L. Gong",
title = "Accelerating {$3$D} nonrigid registration using the
{Cell Broadband Engine} processor",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/rohrer.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "12",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vogt:2009:IBQ,
author = "J.-S. Vogt and R. Land and H. Boettiger and Z.
Krnjajic and H. Baier",
title = "{IBM BladeCenter QS22}: Design, performance, and
utilization in hybrid computing systems",
journal = j-IBM-JRD,
volume = "53",
number = "5",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/535/vogt.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Banavar:2009:P,
author = "G. Banavar and D. Saha and C. Dorais",
title = "Preface",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bhamidipaty:2009:IIQ,
author = "A. Bhamidipaty and N. C. Narendra and S. Nagar and V.
K. Varshneya and M. Vasa and C. Deshwal",
title = "{Indra}: An integrated quantitative system for
compliance management for {IT} service delivery",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/bhamidipaty.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bhide:2009:CFS,
author = "M. Bhide and S. Negi and L. V. Subramaniam and H.
Gupta",
title = "Customer-focused service management for contact
centers",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/bhide.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Black:2009:ATG,
author = "J. Black and R. Gottschalk and T. Lococo and D.
Moore",
title = "Architectures and technologies for the globally
integrated enterprise",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/black.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chang:2009:GIH,
author = "R. N. Chang and W. Falk and H. Hall and P. Kopp and S.
Pappe and M. Schultz and A. Szypka and N. C. Wadia",
title = "Gaining insight into the health of {SOA}
infrastructures",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/chang-falk.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jamjoom:2009:CSD,
author = "H. Jamjoom and H. Qu and M. J. Buco and M. Hernandez
and D. Saha and M. Naghshineh",
title = "Crowdsourcing and service delivery",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/jamjoom.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "12",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Khan:2009:AHF,
author = "A. Khan and H. Jamjoom and J. Sun",
title = "{AIM-HI}: a framework for request routing in
large-scale {IT} global service delivery",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/khan-jamjoom.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lenchner:2009:SDP,
author = "J. Lenchner and D. Rosu and N. F. Velasquez and S. Guo
and K. Christiance and D. DeFelice and P. M. Deshpande
and K. Kummamuru and N. Kraus and L. Z. Luan and D.
Majumdar and M. McLaughlin and S. Ofek-Koifman and
Deepak P. and C.-S. Perng and H. Roitman and C. Ward
and J. Young",
title = "A service delivery platform for server management
services",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/lenchner-rosu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tagg:2009:ISC,
author = "B. S. Tagg",
title = "The {IBM Services Connection}: Service delivery
through self-service portal technologies",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/tagg.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Viswanathan:2009:EDD,
author = "M. Viswanathan and H. Shaikh and A. Sailer and Y. Song
and X. Fang and Y. H. Wu and Z. L. Zou and K. P. Reddy
and A. Deshmukh and M. Gupta and B. Krishnamurthy and
M. Sethi and B. Viswanathan and J. G. Gulla and F.
Matar",
title = "{ERMIS}: Designing, developing, and delivering a
remote managed infrastructure services solution",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/viswanathan-shaikh.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ward:2009:TTB,
author = "C. Ward and S. Agassi and K. Bhattacharya and O. Biran
and R. Cocchiara and M. E. Factor and C. T. Hayashi and
T. Hochberg and B. Kearney and J. Laredo and D.
Loewenstern and A. E. Rodecap and J. K. Skoog and L.
Shwartz and M. Thompson and R. Thompson and Y.
Wolfsthal",
title = "Toward transforming business continuity services",
journal = j-IBM-JRD,
volume = "53",
number = "6",
pages = "??--??",
month = "????",
year = "2009",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/536/ward.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chetlur:2010:SWM,
author = "M. Chetlur and U. Devi and P. Dutta and P. Gupta and
L. Chen and Z. Zhu and S. Kalyanaraman and Y. Lin",
title = "A software {WiMAX} medium access control layer using
massively multithreaded processors",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/chetlur-dutta.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "9",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Franke:2010:EHM,
author = "H. Franke and T. Nelms and H. Yu and H. D. Achilles
and R. Salz",
title = "Exploiting heterogeneous multicore-processor systems
for high-performance network processing",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/franke02.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Franke:2010:IWS,
author = "H. Franke and J. Xenidis and C. Basso and B. M. Bass
and S. S. Woodward and J. D. Brown and C. L. Johnson",
title = "Introduction to the wire-speed processor and
architecture",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/franke03.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Iorio:2010:AFC,
author = "F. Iorio and K. M{\"u}ller and A. Castelfranco and O.
Callanan and T. Sanuki",
title = "Asymmetric flow control for data transfer in hybrid
computing systems",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/iorio-callanan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{LaPotin:2010:WNO,
author = "D. P. LaPotin and S. Daijavad and C. L. Johnson and S.
W. Hunter and K. Ishizaki and H. Franke and H. D.
Achilles and D. P. Dumarot and N. A. Greco and B.
Davari",
title = "Workload and network-optimized computing systems",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/lapotin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lin:2010:WNC,
author = "Y. Lin and L. Shao and Z. Zhu and Q. Wang and R. K.
Sabhikhi",
title = "Wireless network cloud: Architecture and system
requirements",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/lin.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Neeser:2010:SII,
author = "F. D. Neeser and B. Metzler and P. W. Frey",
title = "{SoftRDMA}: Implementing {iWARP} over {TCP} kernel
sockets",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/neeser.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ohara:2010:ARR,
author = "M. Ohara",
title = "Aggregating {REST} requests to accelerate {Web 2.0}
applications",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/ohara.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pattnaik:2010:P,
author = "P. Pattnaik and S. Daijavads",
title = "Preface",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wright:2010:SSP,
author = "C. P. Wright and E. M. Nahum and D. Wood and J. M.
Tracey and E. C. Hu",
title = "{SIP} server performance on multicore systems",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/wright-tracey.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zhu:2010:VPM,
author = "Z. Zhu and L. Chen and Y. Lin and L. Shao",
title = "{VoIP} performance on multicore platforms",
journal = j-IBM-JRD,
volume = "54",
number = "1",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/541/zhu.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "10",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bardhan:2010:IPP,
author = "I. R. Bardhan and R. J. Kauffman and S. Naranpanawe",
title = "{IT} project portfolio optimization: a risk
management approach to software development
governance",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/bardhan.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "2",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Carney:2010:IME,
author = "J. G. Carney",
title = "Industry models for enterprise data management in
financial markets",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/carney.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "6",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dubinsky:2010:EMR,
author = "Y. Dubinsky and A. Yaeli and A. Kofman",
title = "Effective management of roles and responsibilities:
Driving accountability in software development teams",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/dubinsky.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "4",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eleftheriou:2010:ANP,
author = "E. Eleftheriou and S. {\"O}l{\c{c}}er and R. A.
Hutchins",
title = "Adaptive noise-predictive maximum-likelihood ({NPML})
data detection for magnetic tape storage systems",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/eleftheriou.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "7",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ratakonda:2010:ITP,
author = "K. Ratakonda and R. Williams and J. Bisceglia and R.
W. Taylor and J. Graham",
title = "Identifying trouble patterns in complex {IT} services
engagements",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/ratakonda-williams.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "5",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vahaniitty:2010:SSO,
author = "J. V{\"a}h{\"a}niitty and K. Rautiainen and C.
Lassenius",
title = "Small software organizations need explicit project
portfolio management",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/vahaniitty.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "1",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wang:2010:SHD,
author = "L.-K. Wang and M. A. Erle and C. Tsen and E. M.
Schwarz and M. J. Schulte",
title = "A survey of hardware designs for decimal arithmetic",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "8:1--8:15",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2040930",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/wang-schwarz.html",
abstract = "Decimal data and decimal arithmetic operations are
ubiquitous in daily life. Although microprocessors
normally use binary arithmetic for computations,
decimal arithmetic is often required in financial and
commercial applications. Due to the increasing
importance of and demand for decimal arithmetic,
decimal floating-point (DFP) formats and operations are
specified in the revised IEEE Standard for
Floating-Point Arithmetic (IEEE 754-2008). This paper
provides a survey of hardware designs for decimal
arithmetic. It gives an overview of DFP arithmetic in
IEEE 754-2008, describes processors that provide
hardware and instruction set support for decimal
arithmetic, and provides a survey of hardware designs
for decimal addition, subtraction, multiplication, and
division. Finally, it describes potential areas for
future research.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "8",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "decimal floating-point arithmetic",
}
@Article{Williams:2010:P,
author = "Clay Williams and Murray Cantors and John J. Ritsko
and Editor-in-Chief",
title = "Preface",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/preface.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Woodward:2010:AMS,
author = "E. V. Woodward and R. Bowers and V. S. Thio and K.
Johnson and M. Srihari and C. J. Bracht",
title = "Agile methods for software practice transformation",
journal = j-IBM-JRD,
volume = "54",
number = "2",
pages = "??--??",
month = "????",
year = "2010",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat May 1 17:44:14 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
URL = "http://www.research.ibm.com/journal/abstracts/rd/542/woodward.html",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
articleno = "3",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ray:2010:PBI,
author = "B. Ray and K. McAuliffe",
title = "Preface: Business Integrity and Risk Management",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "1--2",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2044842",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{vonKanel:2010:TKE,
author = "J. von Kanel and E. W. Cope and L. A. Deleris and N.
Nayak and R. G. Torok",
title = "Three key enablers to successful enterprise risk
management",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "1:1--1:15",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2043973",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hubbard:2010:PSM,
author = "D. Hubbard and D. Evans",
title = "Problems with scoring methods and ordinal scales in
risk assessment",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "2:1--2:10",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2042914",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Foley:2010:RMF,
author = "S. N. Foley and H. Moss",
title = "A risk-metric framework for enterprise risk
management",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "3:1--3:10",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2043403",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cope:2010:IRB,
author = "E. W. Cope and J. M. Kuster and D. Etzweiler and L. A.
Deleris and B. Ray",
title = "Incorporating risk into business process models",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "4:1--4:13",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2045777",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anderson:2010:FOI,
author = "E. E. Anderson",
title = "Firm objectives, {IT} alignment, and information
security",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "5:1--5:7",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2044256",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Elisseeff:2010:CNR,
author = "A. Elisseeff and J.-P. Pellet and E. Pratsini",
title = "Causal networks for risk and compliance: {Methodology}
and application",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "6:1--6:12",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2045251",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shafti:2010:SOC,
author = "F. Shafti and T. Bedford and L. A. Deleris and J. R.
M. Hosking and N. Serban and H. Shen and L. Walls",
title = "Service operation classification for risk management",
journal = j-IBM-JRD,
volume = "54",
number = "3",
pages = "7:1--7:17",
month = may # "\slash " # jun,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2046465",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Martin:2010:PTS,
author = "J. L. Martin and H. Varilly and J. Cohn and G. R.
Wightwick",
title = "Preface: {Technologies} for a {Smarter Planet}",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--2",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2051498",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Harrison:2010:FSC,
author = "C. Harrison and B. Eckman and R. Hamilton and P.
Hartswick and J. Kalagnanam and J. Paraszczak and P.
Williams",
title = "Foundations for {Smarter Cities}",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--16",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2048257",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jennings:2010:MRS,
author = "P. Jennings",
title = "Managing the risks of {Smarter Planet} solutions",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--9",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2050540",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Spangler:2010:SPS,
author = "W. S. Spangler and J. T. Kreulen and Y. Chen and L.
Proctor and A. Alba and A. Lelescu and A. Behal",
title = "A smarter process for sensing the information space",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--13",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2050541",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Molloy:2010:IDC,
author = "C. Molloy and M. Iqbal",
title = "Improving data-center efficiency for a {Smarter
Planet}",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--8",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2050539",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stanford-Clark:2010:APS,
author = "A. J. Stanford-Clark and G. R. Wightwick",
title = "The application of publish\slash subscribe messaging
to environmental, monitoring, and control systems",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--7",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2050982",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Isom:2010:IEA,
author = "P. K. Isom and S. L. Miller-Sylvia and S. Vaidya",
title = "{Intelligent Enterprise Architecture}",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--2",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2051750",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ganis:2010:BRW,
author = "M. Ganis and E. M. Maximilien and T. Rivera",
title = "A brief report on working smarter with {Agile}
software development",
journal = j-IBM-JRD,
volume = "54",
number = "4",
pages = "1--10",
month = jul # "\slash " # aug,
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2051279",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Sep 13 11:01:30 MDT 2010",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Blainey:2010:PCS,
author = "B. Blainey and H. Franke and M. Hind",
title = "Preface: Commercial software for multicore systems",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "0:1--0:3",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2064830",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sciampacone:2010:EMS,
author = "R. A. Sciampacone and V. Sundaresan and D. Maier and
T. Gray-Donald",
title = "Exploitation of multicore systems in a {Java} virtual
machine",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "1:1--1:11",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2057911",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Altman:2010:OTJ,
author = "E. Altman and M. Arnold and R. Bordawekar and R. M.
Delmonico and N. Mitchell and P. F. Sweeney",
title = "Observations on tuning a {Java} enterprise application
for performance and scalability",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "2:1--2:12",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2057090",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Agarwal:2010:DDP,
author = "R. Agarwal and S. Bensalem and E. Farchi and K.
Havelund and Y. Nir-Buchbinder and S. Stoller and S. Ur
and L. Wang",
title = "Detection of deadlock potentials in multithreaded
programs",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "3:1--3:15",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2060276",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Teng:2010:TPA,
author = "Q. M. Teng and H. C. Wang and Z. Xiao and P. F.
Sweeney and E. Duesterwald",
title = "{THOR}: a performance analysis tool for {Java}
applications running on multicore systems",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "4:1--4:17",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2058481",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cascaval:2010:TAA,
author = "C. Cascaval and S. Chatterjee and H. Franke and K. J.
Gildea and P. Pattnaik",
title = "A taxonomy of accelerator architectures and their
programming models",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "5:1--5:10",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2059721",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jann:2010:ASE,
author = "J. Jann and N. Dubey and R. S. Burugula and P.
Pattnaik",
title = "{AHAFS} subsystem for enhancing operating system
health in the cloud computing era",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "6:1--6:11",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2057091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cho:2010:OPP,
author = "S. M. Cho and D. W. Im and O. Y. Jang and H. J. Song
and B. D. Paulovicks and V. Sheinin and H. Yeo",
title = "{OpenCL} and parallel primitives for digital {TV}
applications",
journal = j-IBM-JRD,
volume = "54",
number = "5",
pages = "7:1--7:14",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2062050",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:19 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shen:2010:PTE,
author = "X. Shen and M. Gupta and H. El-Shishiny and J. J.
Ritsko",
title = "Preface: Technology from emerging-market countries",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "0:1--0:2",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2080070",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zhang:2010:EEC,
author = "L. Zhang and S. Bao and H. Guo and H. Zhu and X. Zhang
and K. Cai and B. Fei and X. Wu and Z. Guo and Z. Su",
title = "{EagleEye}: Entity-centric business intelligence for
smarter decisions",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "1:1--1:11",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2069710",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{He:2010:MIS,
author = "G. He and Y. Sun and Q. Lu and T. Li and H. Lv and W.
Yin and J. Dong",
title = "Multi-index and self-approximate-optimal operation for
a smart electrical power grid",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "2:1--2:14",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2085461",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wang:2010:BBS,
author = "C. Wang and Y. Zhang and X. Chen and Z. Liu and L. Shi
and G. Chen and F. Qiu and C. Ying and W. Lu",
title = "A behavior-based {SMS} antispam system",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "3:1--3:16",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2066050",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Huang:2010:FBL,
author = "Y. Huang and H. Su and W. Sun and J. M. Zhang and C.
J. Guo and J. M. Xu and Z. B. Jiang and S. X. Yang and
J. Zhu",
title = "Framework for building a low-cost, scalable, and
secured platform for {Web}-delivered business
services",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "4:1--4:14",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2065891",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chenthamarakshan:2010:EDS,
author = "V. Chenthamarakshan and K. Dixit and M. Gattani and M.
Goyal and P. Gupta and N. Kambhatla and R. M. Lotlikar
and D. Majumdar and G. R. Parija and S. Roy and S. Soni
and K. Visweswariah",
title = "Effective decision support systems for workforce
deployment",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "5:1--5:15",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2074310",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Agarwal:2010:AIW,
author = "S. K. Agarwal and A. Kumar and A. A. Nanavati and N.
Rajput",
title = "Alternative information {Web} for visually impaired
users in developing countries",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "6:1--6:15",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2066350",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Modani:2010:DAT,
author = "N. Modani and K. Dey and S. Mukherjea and A. A.
Nanavati",
title = "Discovery and analysis of tightly knit communities in
telecom social networks",
journal = j-IBM-JRD,
volume = "54",
number = "6",
pages = "7:1--7:13",
month = "????",
year = "2010",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2081230",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Harrison:2011:PSC,
author = "C. Harrison and J. Paraszczak and R. P. Williams",
title = "Preface: Smarter Cities",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "0:1--0:5",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2093730",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Huestis:2011:CLC,
author = "E. M. Huestis and J. L. Snowdon",
title = "Complexity of legacy city resource management and
value modeling of interagency response",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "1:1--1:12",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2097510",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Besserud:2011:UDU,
author = "K. Besserud and T. Hussey",
title = "Urban design, urban simulation, and the need for
computational tools",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "2:1--2:17",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2097091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Juan:2011:DSS,
author = "Y.-K. Juan and L. Wang and J. Wang and J. O. Leckie
and K.-M. Li",
title = "A decision-support system for smarter city planning
and management",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "3:1--3:12",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2096572",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hogan:2011:USE,
author = "J. Hogan and J. Meegan and R. Parmar and V. Narayan
and R. J. Schloss",
title = "Using standards to enable the transformation to
smarter cities",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "4:1--4:10",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2091051",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Elgedawy:2011:DCC,
author = "I. Elgedawy",
title = "On-demand conversation customization for services in
large smart environments",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "5:1--5:14",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2087170",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rowe:2011:SAL,
author = "A. Rowe and M. E. Berges and G. Bhatia and E. Goldman
and R. Rajkumar and J. H. Garrett and J. M. F. Moura
and L. Soibelman",
title = "{Sensor Andrew}: Large-scale campus-wide sensing and
actuation",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "6:1--6:14",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2089662",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Watteyne:2011:SCT,
author = "T. Watteyne and K. S. J. Pister",
title = "Smarter cities through standards-based wireless sensor
networks",
journal = j-IBM-JRD,
volume = "55",
number = "1--2",
pages = "7:1--7:10",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2010.2092257",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Feb 20 14:29:20 MST 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2011:FC,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "c1--c1",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2121870",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arroyo:2011:IPS,
author = "R. X. Arroyo and R. J. Harrington and S. P. Hartman
and T. Nguyen",
title = "{IBM POWER7} systems",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "1:1--1:13",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2131610",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sinharoy:2011:IPM,
author = "B. Sinharoy and R. Kalla and W. J. Starke and H. Q. Le
and R. Cargnoni and J. A. {Van Norstrand} and
B. J. Ronchetti and J. Stuecheli and J. Leenstra and
G. L. Guthrie and D. Q. Nguyen and B. Blaner and
C. F. Marino and E. Retter and P. Williams",
title = "{IBM POWER7} multicore server processor",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "1:1--1:29",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2127330",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wendel:2011:IPP,
author = "D. F. Wendel and J. Barth and D. M. Dreps and S. Islam
and J. Pille and J. A. Tierno",
title = "{IBM POWER7} processor circuit design",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "1:1--1:8",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2143150",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zyuban:2011:POM,
author = "V. Zyuban and J. Friedrich and C. J. Gonzalez and R.
Rao and M. D. Brown and M. M. Ziegler and H. Jacobson
and S. Islam and S. Chu and P. Kartschoke and G.
Fiorenza and M. Boersma and J. A. Culp",
title = "Power optimization methodology for the {IBM POWER7}
microprocessor",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "1:1--1:9",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2110410",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rajamony:2011:PIP,
author = "R. Rajamony and L. B. Arimilli and K. Gildea",
title = "{PERCS}: The {IBM POWER7-IH} high-performance
computing system",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "3:1--3:12",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2109230",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
abstract = "In 2001, the Defense Advanced Research Projects Agency
called for the creation of commercially viable
computing systems that would not only perform at very
high levels but also be highly productive. The
forthcoming POWER7-IH system known as Productive,
Easy-to-use, Reliable Computing System (PERCS) was
IBM's response to this challenge. Compared with
state-of-the-art high-performance computing systems in
existence today, PERCS has very high performance and
productivity goals and achieves them through tight
integration of computing, networking, storage, and
software. This paper describes the PERCS hardware and
software, along with many of the design decisions that
went into its creation.",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Iyer:2011:NSI,
author = "S. S. Iyer and G. Freeman and C. Brodsky and A. I.
Chou and D. Corliss and S. H. Jain and N. Lustig and V.
McGahay and S. Narasimha and J. Norum and K. A. Nummy
and P. Parries and S. Sankaran and C. D. Sheraw and P.
R. Varanasi and G. Wang and M. E. Weybright and X. Yu
and E. Crabbe and P. Agnello",
title = "45-nm silicon-on-insulator {CMOS} technology
integrating embedded {DRAM} for high-performance server
and {ASIC} applications",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "5:1--5:14",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2108112",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Floyd:2011:AEM,
author = "M. Floyd and M. Ware and K. Rajamani and T. Gloekler
and B. Brock and P. Bose and A. Buyuktosuno{\u{g}}lu
and J. C. Rubio and B. Schubert and B. Spruth and J. A.
Tierno and L. Pesantez",
title = "Adaptive energy-management features of the {IBM
POWER7} chip",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "8:1--8:18",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2114250",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Friedrich:2011:DMI,
author = "J. Friedrich and R. Puri and U. Brandt and M. Buehler
and J. DiLullo and J. Hopkins and M. Hossain and M.
Kazda and J. Keinert and Z. M. Kurzum and D. Lamb and
A. Lee and F. Musante and J. Noack and P. J. Osler and
S. Posluszny and H. Qian and S. Ramji and V. Rao and L.
N. Reddy and H. Ren and T. Rosser and B. R. Russell and
C. Sze and G. Tellez",
title = "Design methodology for the {IBM POWER7}
microprocessor",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "9:1--9:14",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2105692",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schubert:2011:FVI,
author = "K.-D. Schubert and W. Roesner and J. M. Ludden and J.
Jackson and J. Buchert and V. Paruthi and M. Behm and
A. Ziv and J. Schumann and C. Meissner and J. Koesters
and J. Hsu and B. Brock",
title = "Functional verification of the {IBM POWER7}
microprocessor and {POWER7} multiprocessor systems",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "10:1--10:17",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2117370",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:48 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kano:2011:UCM,
author = "Y. Kano and M. Miwa and K. B. Cohen and L. E. Hunter
and S. Ananiadou and J. Tsujii",
title = "{U}-Compare: a modular {NLP} workflow construction
and evaluation system",
journal = j-IBM-JRD,
volume = "55",
number = "3",
pages = "11:1--11:10",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2105691",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri May 13 18:44:50 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tromp:2011:PCL,
author = "R. M. Tromp and J. B. Hannon",
title = "Preface: Cathode Lens Microscopy for Nanoscience",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "0:1--0:3",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2159450",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schramm:2011:LEE,
author = "S. M. Schramm and J. Kautz and A. Berghaus and O.
Schaff and R. M. Tromp and S. J. van der Molen",
title = "Low-energy electron microscopy and spectroscopy with
{ESCHER}: {Status} and prospects",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "1:1--1:7",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2150691",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mullerova:2011:STL,
author = "I. Mullerova and M. Hovorka and I. Konvalina and M.
Uncovsky and L. Frank",
title = "Scanning transmission low-energy electron microscopy",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "2:1--2:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2156190",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kennedy:2011:LCI,
author = "S. M. Kennedy and D. E. Jesson and D. M. Paganin",
title = "{Laplacian} and caustic imaging theories of {MEM}
work-function contrast",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "3:1--3:8",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2143310",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hofer:2011:LEP,
author = "A. Hofer and K. Duncker and M. Kiel and S. Forster and
W. Widdra",
title = "Laser-excited {PEEM} using a fully tunable fs-laser
system",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "4:1--4:8",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2156210",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Christensen:2011:PSE,
author = "S. L. Christensen and B. M. Haines and U. D. Lanke and
M. F. Paige and S. G. Urquhart",
title = "Partial secondary electron-yield {NEXAFS}
spectromicroscopy with an energy-filtered {X-PEEM}",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "5:1--5:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2143550",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zakharov:2011:NDB,
author = "A. A. Zakharov and C. Virojanadara and S.
Watcharinyanon and R. Yakimova and L. I. Johansson",
title = "Nanoscale {$3$-D} {$(E, k_x, k_y)$} band structure
imaging on graphene and intercalated graphene",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "6:1--6:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2143570",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sun:2011:HUS,
author = "J. Sun and J. B. Hannon and R. M. Tromp and K. Pohl",
title = "Highly uniform step and terrace structures on
{SiC(0001)} surfaces",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "7:1--7:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2156230",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:24 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meyer:2011:SOU,
author = "A. Meyer and J. I. Flege and S. D. Senanayake and B.
Kaemena and R. E. Rettew and F. M. Alamgir and J.
Falta",
title = "In situ oxidation of ultrathin silver films on
{Ni(111)}",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "8:1--8:7",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2157262",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wall:2011:SOC,
author = "D. Wall and S. Tikhonov and S. Sindermann and D.
Spoddig and C. Hassel and M. Horn-von Hoegen and F.-J.
Meyer zu Heringdorf",
title = "Shape, orientation, and crystalline composition of
silver islands on {Si(111)}",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "9:1--9:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2158761",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tang:2011:GDS,
author = "W.-X. Tang and C.-X. Zheng and Z.-Y. Zhou and D. E.
Jesson and J. Tersoff",
title = "{Ga} droplet surface dynamics during {Langmuir}
evaporation of {GaAs}",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "10:1--10:7",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2158762",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Speckmann:2011:ASI,
author = "M. Speckmann and T. Schmidt and J. I. Flege and J.
Falta",
title = "In adsorption on {Si(112)} and its impact on {Ge}
growth",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "11:1--11:8",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2158763",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yamaguchi:2011:XPS,
author = "R. Yamaguchi and K. Terashima and K. Fukumoto and Y.
Takada and M. Kotsugi and Y. Miyata and K. Mima and S.
Komori and S. Itoda and Y. Nakatsu and M. Yano and N.
Miyamoto and T. Nakamura and T. Kinoshita and Y.
Watanabe and A. Manabe and S. Suga and S. Imada",
title = "An {XMCD--PEEM} study on magnetized {Dy-doped
Nd--Fe-B} permanent magnets",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "12:1--12:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2159148",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kotsugi:2011:DMA,
author = "M. Kotsugi and T. Wakita and T. Taniuchi and H.
Maruyama and C. Mitsumata and K. Ono and M. Suzuki and
N. Kawamura and N. Ishimatsu and M. Oshima and Y.
Watanabe and M. Taniguchi",
title = "Direct metallographic analysis of an iron meteorite
using hard {X}-ray photoelectron emission microscopy",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "13:1--13:5",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2159159",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vaughn:2011:TEE,
author = "J. M. Vaughn and C. Wan and K. D. Jamison and M. E.
Kordesch",
title = "Thermionic electron emission microscopy of metal-oxide
multilayers on tungsten",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "14:1--14:6",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2159423",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hlawacek:2011:DSG,
author = "G. Hlawacek and F. S. Khokar and R. van Gastel and C.
Teichert and B. Poelsema",
title = "Diffusion and submonolayer growth of para-sexiphenyl
on {Ir(111)} and {Ir(111)}-supported graphene",
journal = j-IBM-JRD,
volume = "55",
number = "4",
pages = "15:1--15:7",
month = "????",
year = "2011",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2160303",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Sep 16 12:27:25 MDT 2011",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www.research.ibm.com/journal/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:FCa,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "C1--C1",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2181688",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "1--2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2184492",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Haas:2012:IIZ,
author = "J. Haas and R. Wallner",
title = "Introduction: {IBM zEnterprise} Systems and
Technology",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "0:1--0:6",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2173854",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Busaba:2012:IZM,
author = "F. Busaba and M. A. Blake and B. Curran and M. Fee and
C. Jacobi and P.-K. Mak and B. R. Prasky and C. R.
Walters",
title = "{IBM zEnterprise 196} microprocessor and cache
subsystem",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "1:1--1:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2173962",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Strach:2012:EPI,
author = "T. Strach and F. Bosco and K. L. Christian and K. R.
Covi and M. Eckert and G. R. Edlund and R. Frech and H.
Harrer and A. Huber and D. Kaller and M. Kindscher and
A. Z. Muszynski and G. A. Peterson and C. Siviero and
J. Supper and O. A. Torreiter and T.-M. Winkel",
title = "Electronic packaging of the {IBM System z196}
enterprise-class server processor cage",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "2:1--2:19",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177107",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{VanHuben:2012:SCD,
author = "G. A. {Van Huben} and K. D. Lamb and R. B. Tremaine
and B. E. Aleman and S. M. Rubow and S. H. Rider and
W. E. Maule and M. E. Wazlowski",
title = "Server-class {DDR3 SDRAM} memory buffer chip",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "3:1--3:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177897",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meaney:2012:IZR,
author = "P. J. Meaney and L. A. Lastras-Montano and V. K.
Papazova and E. Stephens and J. S. Johnson and L. C.
Alves and J. A. O'Connor and W. J. Clarke",
title = "{IBM zEnterprise} redundant array of independent
memory subsystem",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "4:1--4:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177106",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webel:2012:SMP,
author = "T. Webel and T. Pflueger and R. Ludewig and C.
Lichtenau and W. Niklaus and R. Schaufler",
title = "Scalable and modular pervasive logic\slash firmware
design",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "5:1--5:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177571",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Greiner:2012:PII,
author = "D. F. Greiner and M. M. Mitran and T. J. Slegel and C.
R. Walters and C. F. Webb",
title = "Performance innovation in the {IBM zEnterprise 196}
processor",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "6:1--6:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177906",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Conklin:2012:CUS,
author = "C. R. Conklin and W. Niklaus and R. Schaufler and S.
Swaney",
title = "Concurrently update the scan-initialization data of a
processor core",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "7:1--7:6",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177908",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gregg:2012:OIZ,
author = "T. A. Gregg and D. Craddock and D. J. Stigliani and F.
E. Bosco and E. E. Cruz and M. F. Scanlon and P. Sciuto
and G. Bayer and M. Jung and C. Raisch",
title = "Overview of {IBM zEnterprise 196 I/O} subsystem with
focus on new {PCI Express} infrastructure",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "8:1--8:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2178278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dorsch:2012:IPS,
author = "R. Dorsch and R. K. Errickson and M. M. Helms and G.
Crew and T. A. Gregg and W. Haileselassie and L. W.
Helmer and A. Kohler and K. Pandey and S. Roscher and
E. S. Rotter and C. Haubelt",
title = "{IBM Parallel Sysplex} design for the {IBM z196}
system",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "9:1--9:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177910",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arnold:2012:ICC,
author = "T. W. Arnold and C. Buscaglia and F. Chan and V.
Condorelli and J. Dayka and W. Santiago-Fernandez and
N. Hadzic and M. D. Hocker and M. Jordan and T. E.
Morris and K. Werner",
title = "{IBM 4765} cryptographic coprocessor",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "10:1--10:13",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2178736",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Amann:2012:IZS,
author = "S. Amann and G. Banzhaf and C. A. Bender and T. Bubb
and D. F. Casper and J. R. Flanagan and R. Friedrich
and R. Higgs and G. Kuch and C. Schmitt and M. Zee",
title = "{IBM zEnterprise} storage {I/O} advancements",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "11:1--11:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2177919",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andres:2012:IZE,
author = "M. Andres and A. Bieswanger and F. Bosco and G. F.
Goth and H. Hering and W. Kostenko and T. B. Mathias
and T. Pohl and H. Wen",
title = "{IBM zEnterprise} energy management",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "12:1--12:13",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2178565",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Krygowski:2012:KAP,
author = "C. A. Krygowski and E. Almog and D. G. Bair and R.
Breil and G. Dittmann and R. M. Gott and W. J. Lewis
and A. D. Shah and B. W. Thompto",
title = "Key advances in the presilicon functional verification
of the {IBM zEnterprise} microprocessor and storage
hierarchy",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "13:1--13:16",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2178737",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koerner:2012:FVS,
author = "S. Koerner and C. Werner and T. Hess and P. Schulz and
M. Strasser and S. Wagner and H. B{\"o}hm and
M. Troester and D. Bolte and H. Elfering and T. Pohl
and K. Theurich and W. H. Miller and P. Szwed",
title = "Firmware verification and simulation in {IBM
zEnterprise 196}",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "14:1--14:17",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2178566",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Beichter:2012:ISZ,
author = "F. Beichter and T. D. Butler and S. B. Compton and D.
F. Riedy and M. H. Sabins and H. M. Yudenfriend",
title = "{IBM System z I/O} discovery and autoconfiguration",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "15:1--15:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2179230",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Frey:2012:IUR,
author = "J. A. Frey and F. Baitinger and J. M. Gdaniec",
title = "{IBM Unified Resource Manager} introduction and
overview",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "16:1--16:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2179133",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Valentine:2012:IZH,
author = "B. D. Valentine and H. Osterndorf and F. M. Welter and
D. Appich and J. A. Wierbowski and D. T. Simpson",
title = "{IBM zBX} hardware management and operational
controls",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "17:1--17:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2179229",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mayer:2012:URM,
author = "C. Mayer and F. Baitinger and S. Amann and G. McAfee
and A. Nunez Mencias",
title = "{Unified Resource Manager} virtualization management",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "18:1--18:9",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2011.2180750",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yocom:2012:IZU,
author = "P. Yocom and H. Shah and M. F. Hulber",
title = "{IBM zEnterprise Unified Resource Manager} platform
performance management",
journal = j-IBM-JRD,
volume = "56",
number = "1--2",
pages = "19:1--19:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2182856",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:FCb,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "56",
number = "3",
pages = "C1--C1",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2190556",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "1--2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2190560",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ferrucci:2012:IW,
author = "D. A. Ferrucci",
title = "Introduction to {This is Watson}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "1:1--1:15",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2184356",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lally:2012:QAH,
author = "A. Lally and J. M. Prager and M. C. McCord and B. K.
Boguraev and S. Patwardhan and J. Fan and P. Fodor and
J. Chu-Carroll",
title = "Question analysis: How {Watson} reads a clue",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "2:1--2:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2184637",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McCord:2012:DPW,
author = "M. C. McCord and J. W. Murdock and B. K. Boguraev",
title = "Deep parsing in {Watson}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "3:1--3:15",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2185409",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chu-Carroll:2012:TRA,
author = "J. Chu-Carroll and J. Fan and N. Schlaefer and W.
Zadrozny",
title = "Textual resource acquisition and engineering",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "4:1--4:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2185901",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fan:2012:AKE,
author = "J. Fan and A. Kalyanpur and D. C. Gondek and D. A.
Ferrucci",
title = "Automatic knowledge extraction from documents",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "5:1--5:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2186519",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chu-Carroll:2012:FNH,
author = "J. Chu-Carroll and J. Fan and B. K. Boguraev and D.
Carmel and D. Sheinwald and C. Welty",
title = "Finding needles in the haystack: Search and candidate
generation",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "6:1--6:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2186682",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Murdock:2012:TCA,
author = "J. W. Murdock and A. Kalyanpur and C. Welty and J. Fan
and D. A. Ferrucci and D. C. Gondek and L. Zhang and H.
Kanayama",
title = "Typing candidate answers using type coercion",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "7:1--7:13",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2187036",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Murdock:2012:TEG,
author = "J. W. Murdock and J. Fan and A. Lally and H. Shima and
B. K. Boguraev",
title = "Textual evidence gathering and analysis",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "8:1--8:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2187249",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wang:2012:RES,
author = "C. Wang and A. Kalyanpur and J. Fan and B. K. Boguraev
and D. C. Gondek",
title = "Relation extraction and scoring in {DeepQA}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "9:1--9:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2187239",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kalyanpur:2012:SDI,
author = "A. Kalyanpur and B. K. Boguraev and S. Patwardhan and
J. W. Murdock and A. Lally and C. Welty and J. M.
Prager and B. Coppola and A. Fokoue-Nkoutche and L.
Zhang and Y. Pan and Z. M. Qiu",
title = "Structured data and inference in {DeepQA}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "10:1--10:14",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188737",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Prager:2012:SQT,
author = "J. M. Prager and E. W. Brown and J. Chu-Carroll",
title = "Special questions and techniques",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "11:1--11:13",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2187392",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chu-Carroll:2012:IIR,
author = "J. Chu-Carroll and E. W. Brown and A. Lally and J. W.
Murdock",
title = "Identifying implicit relationships",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "12:1--12:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188154",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kalyanpur:2012:FBQ,
author = "A. Kalyanpur and S. Patwardhan and B. K. Boguraev and
A. Lally and J. Chu-Carroll",
title = "Fact-based question decomposition in {DeepQA}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "13:1--13:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188934",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gondek:2012:FMR,
author = "D. C. Gondek and A. Lally and A. Kalyanpur and J. W.
Murdock and P. A. Duboue and L. Zhang and Y. Pan and Z.
M. Qiu and C. Welty",
title = "A framework for merging and ranking of answers in
{DeepQA}",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "14:1--14:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188760",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Epstein:2012:MWF,
author = "E. A. Epstein and M. I. Schor and B. S. Iyer and A.
Lally and E. W. Brown and J. Cwiklik",
title = "Making {Watson} fast",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "15:1--15:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188761",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tesauro:2012:SLO,
author = "G. Tesauro and D. C. Gondek and J. Lenchner and J. Fan
and J. M. Prager",
title = "Simulation, learning, and optimization techniques in
{Watson}'s game strategies",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "16:1--16:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188931",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lewis:2012:GIB,
author = "B. L. Lewis",
title = "In the game: The interface between {Watson} and
{Jeopardy}!",
journal = j-IBM-JRD,
volume = "56",
number = "3--4",
pages = "17:1--17:6",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2188932",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Apr 13 09:44:32 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen-Ritzo:2012:PTH,
author = "C.-H. Chen-Ritzo and J. Hu",
title = "Preface: Technologies for healthcare transformation",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "0:1--0:2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2191182",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261576",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shabo:2012:MUP,
author = "A. Shabo",
title = "Meaningful use of patient-centric health records for
healthcare transformation",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "1:1--1:7",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2194011",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261583",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "1--2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2205304",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261572",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Buckeridge:2012:IRT,
author = "D. L. Buckeridge and M. Izadi and A. Shaban-Nejad and
L. Mondor and C. Jauvin and L. Dube and Y. Jang and R.
Tamblyn",
title = "An infrastructure for real-time population health
assessment and monitoring",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "2:1--2:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2197132",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261575",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sow:2012:RTA,
author = "D. M. Sow and J. Sun and A. Biem and J. Hu and M. L.
Blount and S. Ebadollahi",
title = "Real-time analysis for short-term prognosis in
intensive care",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "3:1--3:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2197952",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261584",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Markatou:2012:CBR,
author = "M. Markatou and P. K. Don and J. Hu and F. Wang and J.
Sun and R. Sorrentino and S. Ebadollahi",
title = "Case-based reasoning in comparative effectiveness
research",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "4:1--4:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2198311",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261579",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sun:2012:FOS,
author = "X. Sun and L. Xu and Y. Yu and Y. Pan",
title = "Facilitating observational study for comparative
effectiveness research",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "5:1--5:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2198589",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261585",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gotz:2012:MVA,
author = "D. H. Gotz and J. Sun and N. Cao",
title = "Multifaceted visual analytics for healthcare
applications",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "6:1--6:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2199170",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261577",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ordonez:2012:VMT,
author = "P. Ordonez and T. Oates and M. E. Lombardi and G.
Hernandez and K. W. Holmes and J. Fackler and C. U.
Lehmann",
title = "Visualization of multivariate time-series data in a
neonatal {ICU}",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "7:1--7:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2200431",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261581",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mason:2012:CDM,
author = "J. E. Mason and B. T. Denton",
title = "A comparison of decision-maker perspectives for
optimal cholesterol treatment",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "8:1--8:12",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2201849",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261580",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marinescu:2012:ATD,
author = "R. Marinescu",
title = "Assessing technical debt by identifying design flaws
in software systems",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "9:1--9:13",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2204512",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261578",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Robertson-Dunn:2012:BZF,
author = "B. Robertson-Dunn",
title = "Beyond the {Zachman} framework: Problem-oriented
system architecture",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "10:1--10:9",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2205633",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261582",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:Ca,
author = "Anonymous",
title = "Cover 2",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "C2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2205306",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261573",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:Cb,
author = "Anonymous",
title = "Cover 3",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "C3",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2205307",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261574",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:FCc,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "56",
number = "5",
pages = "C1",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2205305",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 11 14:32:34 MDT 2012",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6257445",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sanford:2012:MSV,
author = "L. S. Sanford",
title = "Message from the {Senior Vice President, Enterprise
Transformation}",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "0:1",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2217672",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353931",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vayghan:2012:PIE,
author = "J. Vayghan",
title = "Preface: {IT}-enabled business transformation at
{IBM}",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "0:1--0:3",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2206849",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353962",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Urso:2012:ETI,
author = "D. L. Urso and M. T. Dunham and C. Passi and M.
Overstreet and J. Viezel and N. Harling",
title = "Enterprise transformation: The {IBM} journey to {Value
Services}",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "1:1--1:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2207773",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353958",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:TC,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "1--2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2225975",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6356006",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{DeViney:2012:BGI,
author = "N. DeViney and K. Sturtevant and F. Zadeh and L.
Peluso and P. Tambor",
title = "Becoming a globally integrated enterprise: Lessons on
enabling organizational and cultural change",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "2:1--2:8",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2206149",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353944",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Massie:2012:ITR,
author = "J. G. Massie and W. J. Davis",
title = "{IBM} toolkit for radical simplification of business
processes",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "3:1--3:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2210337",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353952",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sylvia:2012:TIT,
author = "M. J. Sylvia and R. C. Hughes and J. E. Moore and J.
W. Murray and B. L. Peterson and S. R. Uniack",
title = "Transforming the information technology infrastructure
of {IBM}",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "4:1--4:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2211811",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353955",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Danko:2012:HPE,
author = "T. Danko and D. G. Downs and A. Dunlap-Kraft and J. R.
Walkup",
title = "Helping people embrace change in {IT}-enabled business
transformations",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "5:1--5:9",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2212634",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353943",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schaffer:2012:EII,
author = "J. S. Schaffer and M. L. Stokes and N. Yan",
title = "Enabling an integrated identity from disparate
sources",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "6:1--6:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2214091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6355654",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "digital identities for Web users; social computing;
user privacy",
}
@Article{Apte:2012:BLT,
author = "C. Apte and B. Dietrich and M. Fleming",
title = "Business leadership through analytics",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "7:1--7:5",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2214555",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353941",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baier:2012:SFP,
author = "M. Baier and J. E. Carballo and A. J. Chang and Y. Lu
and A. Mojsilovic and M. J. Richard and M. Singh and M.
S. Squillante and K. R. Varshney",
title = "Sales-force performance analytics and optimization",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "8:1--8:10",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2216314",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353942",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kapoor:2012:ETA,
author = "S. Kapoor and B. K. Ray and C. Toft-Nielsen and K.
Dobrindt and K. Anikeev and D. Subramanian and Y.
Drissi and C. Jiang and J. Fu",
title = "Enterprise transformation: An analytics-based approach
to strategic planning",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "9:1--9:11",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2217673",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353948",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yarter:2012:PCD,
author = "L. C. Yarter",
title = "Private cloud delivery model for supplying centralized
analytics services",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "10:1--10:6",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2216331",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353964",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dischinger:2012:SCS,
author = "J. S. Dischinger and C. D. Karwatowski and A. Raina",
title = "Supplier Connection: a supply-chain ecosystem for
small business job growth",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "11:1--11:9",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2218071",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353945",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:Cc,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "C1--C1",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2216212",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353937",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:Cd,
author = "Anonymous",
title = "Cover 2",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "C2--C2",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2216214",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353939",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2012:Ce,
author = "Anonymous",
title = "Cover 3",
journal = j-IBM-JRD,
volume = "56",
number = "6",
pages = "C3--C3",
month = "????",
year = "2012",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2216215",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Jan 25 11:44:56 MST 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353940",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
book-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Team:2013:IBG,
author = "{IBM Blue Gene Team}",
title = "The {IBM Blue Gene} project",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "0:1--0:6",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2220487",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Team:2013:DIB,
author = "{IBM Blue Gene Team}",
title = "Design of the {IBM Blue Gene\slash Q} Compute chip",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "1:1--1:13",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2222991",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coteus:2013:PIB,
author = "P. W. Coteus and S. A. Hall and T. Takken and R. A.
Rand and S. Tian and G. V. Kopcsay and R. Bickford and
F. P. Giordano and C. M. Marroquin and M. J. Jeanson",
title = "Packaging the {IBM Blue Gene\slash Q} supercomputer",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "2:1--2:13",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2225922",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sugavanam:2013:DLP,
author = "K. Sugavanam and C.-Y. Cher and J. A. Gunnels and R.
A. Haring and P. Heidelberger and H. M. Jacobson and M.
K. McManus and D. P. Paulsen and D. L. Satterfield and
Y. Sugawara and R. Walkup",
title = "Design for low power and power management in {IBM Blue
Gene\slash Q}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "3:1--3:11",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2227034",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bertran:2013:ALP,
author = "R. Bertran and Y. Sugawara and H. M. Jacobson and A.
Buyuktosunoglu and P. Bose",
title = "Application-level power and performance
characterization and optimization on {IBM Blue
Gene\slash Q} systems",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "4:1--4:17",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2227580",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ryu:2013:IBG,
author = "K. D. Ryu and T. A. Inglett and R. Bellofatto and M.
A. Blocksome and T. Gooding and S. Kumar and A. R.
Mamidala and M. G. Megerian and S. Miller and M. T.
Nelson and B. Rosenburg and B. Smith and J. {Van
Oosten} and A. Wang and R. W. Wisniewski",
title = "{IBM Blue Gene\slash Q} system software stack",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "5:1--5:12",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2227557",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Team:2013:MVC,
author = "{IBM Blue Gene Team}",
title = "Modeling, validation, and co-design of {IBM Blue
Gene\slash Q}: Tools and examples",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "6:1--6:12",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2227577",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ohmacht:2013:IBG,
author = "M. Ohmacht and A. Wang and T. Gooding and B. Nathanson
and I. Nair and G. Janssen and M. Schaal and B.
Steinmacher-Burow",
title = "{IBM Blue Gene\slash Q} memory subsystem with
speculative execution and transactional memory",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "7:1--7:12",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2228092",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eichenberger:2013:ELO,
author = "A. E. Eichenberger and K. O'Brien",
title = "Experimenting with low-overhead {OpenMP} runtime on
{IBM Blue Gene\slash Q}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "8:1--8:8",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2228769",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Evangelinos:2013:DPC,
author = "C. Evangelinos and R. E. Walkup and V. Sachdeva and K.
E. Jordan and H. Gahvari and I.-H. Chung and M. P.
Perrone and L. Lu and L.-K. Liu and K. Magerlein",
title = "Determination of performance characteristics of
scientific applications on {IBM Blue Gene\slash Q}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "9:1--9:12",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2229901",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Checconi:2013:MDA,
author = "F. Checconi and F. Petrini",
title = "Massive data analytics: The {Graph 500} on {IBM Blue
Gene\slash Q}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "10:1--10:11",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2232414",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Carnes:2013:SLI,
author = "B. Carnes and B. Chan and E. W. Draeger and J.-L.
Fattebert and L. Fried and J. Glosli and W. D. Krauss
and S. H. Langer and R. McCallen and A. A. Mirin and F.
Najjar and A. L. Nichols and T. Oppelstrup and J. A.
Rathkopf and D. Richards and F. Streitz and P. M.
Vranas and J. J. Rice and J. A. Gunnels and V. Gurev
and C. Kim and J. Magerlein and M. Reumann and H.-F.
Wen",
title = "Science at {LLNL} with {IBM Blue Gene\slash Q}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "11:1--11:18",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2233371",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coghlan:2013:AAI,
author = "S. Coghlan and K. Kumaran and R. M. Loy and P. Messina
and V. Morozov and J. C. Osborn and S. Parker and K. M.
Riley and N. A. Romero and T. J. Williams",
title = "{Argonne} applications for the {IBM Blue Gene\slash
Q}, {Mira}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "12:1--12:11",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2238371",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Boyle:2013:CDI,
author = "P. A. Boyle and N. H. Christ and C. Kim",
title = "Co-design of the {IBM Blue Gene\slash Q Level 1}
prefetch engine with {QCD}",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "13:1--13:10",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2237149",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Alam:2013:EES,
author = "S. Alam and C. Bekas and H. Boettiger and A. Curioni
and G. Fourestey and W. Homberg and M. Knobloch and T.
Laino and T. Maurer and B. Mohr and D. Pleiter and A.
Schiller and T. Schulthess and V. Weber",
title = "Early experiences with scientific applications on the
{IBM Blue Gene\slash Q} supercomputer",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "14:1--14:9",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2234331",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dong:2013:FEV,
author = "J. Dong and M. Xie and L. Zhao and D. Shang",
title = "A framework for electric vehicle charging-point
network optimization",
journal = j-IBM-JRD,
volume = "57",
number = "1/2",
pages = "15:1--15:9",
month = jan # "--" # mar,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2012.2234325",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:15 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Malik:2013:GBD,
author = "P. Malik",
title = "Governing {Big Data}: Principles and practices",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "1:1--1:13",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2241359",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ghoting:2013:TOM,
author = "A. N. Ghoting and J. A. Gunnels and P. Kambadur and E.
P. Pednault and M. S. Squillante",
title = "Trends and outlook for the massive-scale analytics
stack",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "2:1--2:11",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2242673",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hofstee:2013:USD,
author = "H. P. Hofstee and G. C. Chen and F. H. Gebara and K.
Hall and J. Herring and D. Jamsek and J. Li and Y. Li
and J. W. Shi and P. W. Y. Wong",
title = "Understanding system design for {Big Data} workloads",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "3:1--3:10",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2242674",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Balmin:2013:PEA,
author = "A. Balmin and K. Beyer and V. Ercegovac and J.
McPherson and F. Ozcan and H. Pirahesh and E. Shekita
and Y. Sismanis and S. Tata and Y. Tian",
title = "A platform for {eXtreme Analytics}",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "4:1--4:11",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2242693",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jain:2013:GSE,
author = "R. Jain and P. Sarkar and D. Subhraveti",
title = "{GPFS--SNC}: An enterprise cluster file system for
{Big Data}",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "5:1--5:10",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2243531",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fong:2013:TSD,
author = "L. L. Fong and Y. Gao and X. R. Guerin and Y. G. Liu
and T. Salo and S. R. Seelam and W. Tan and S. Tata",
title = "Toward a scale-out data-management middleware for
low-latency enterprise computing",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "6:1--6:14",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2240171",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hirzel:2013:ISP,
author = "M. Hirzel and H. Andrade and B. Gedik and G.
Jacques-Silva and R. Khandekar and V. Kumar and M.
Mendell and H. Nasgaard and S. Schneider and R. Soule
and K.-L. Wu",
title = "{IBM Streams Processing Language}: Analyzing {Big
Data} in motion",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "7:1--7:11",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2243535",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Biem:2013:RTA,
author = "A. Biem and H. Feng and A. V. Riabov and D. S.
Turaga",
title = "Real-time analysis and management of big time-series
data",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "8:1--8:12",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2243551",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kasiviswanathan:2013:NDD,
author = "S. P. Kasiviswanathan and G. Cong and P. Melville and
R. D. Lawrence",
title = "Novel document detection for massive data streams
using distributed dictionary learning",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "9:1--9:15",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2247232",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gattiker:2013:BDT,
author = "A. Gattiker and F. H. Gebara and H. P. Hofstee and J.
D. Hayes and A. Hylick",
title = "{Big Data} text-oriented benchmark creation for
{Hadoop}",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "10:1--10:6",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2240732",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zerfos:2013:PAM,
author = "P. Zerfos and M. Srivatsa and H. Yu and D. Dennerline
and H. Franke and D. Agrawal",
title = "Platform and applications for massive-scale streaming
network analytics",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "11:1--11:13",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2245991",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shi:2013:SCD,
author = "J. Shi and W. Xue and W. Wang and Y. Zhang and B. Yang
and J. Li",
title = "Scalable community detection in massive social
networks using {MapReduce}",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "12:1--12:14",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2251982",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Liao:2013:VAL,
author = "Q. Liao and L. Shi and C. Wang",
title = "Visual analysis of large-scale network anomalies",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "13:1--13:12",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2249356",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Konopnicki:2013:SAM,
author = "D. Konopnicki and M. Shmueli-Scheuer and D. Cohen and
B. Sznajder and J. Herzig and A. Raviv and N. Zwerling
and H. Roitman and Y. Mass",
title = "A statistical approach to mining customers'
conversational data from social media",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "14:1--14:13",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2251833",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hayes:2013:RTS,
author = "J. P. Hayes and H. R. Kolar and A. Akhriev and M. G.
Barry and M. E. Purcell and E. P. McKeown",
title = "A real-time stream storage and analysis platform for
underwater acoustic monitoring",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "15:1--15:10",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2245973",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Soffer:2013:PMS,
author = "A. Soffer",
title = "Preface: Massive-scale analytics",
journal = j-IBM-JRD,
volume = "57",
number = "3/4",
pages = "??--??",
month = may # "--" # jul,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jun 24 12:47:17 MDT 2013",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bartholomy:2013:NMT,
author = "E. Bartholomy and G. Greenlee and M. Sylvia",
title = "The need to move toward virtualized and more resilient
disaster-recovery architectures",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "1:1--1:10",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2258759",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vecchiola:2013:ERI,
author = "C. Vecchiola and H. Anjomshoa and Y. Bernstein and I.
Dumitrescu and R. Garnavi and J. von Kanel and G.
Wightwick",
title = "Engineering resilient information systems for
emergency management",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "2:1--2:12",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2259432",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Queiroz:2013:PMQ,
author = "C. Queiroz and S. K. Garg and Z. Tari",
title = "A probabilistic model for quantifying the resilience
of networked systems",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "3:1--3:9",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2259433",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rogstadius:2013:CCS,
author = "J. Rogstadius and M. Vukovic and C. A. Teixeira and V.
Kostakos and E. Karapanos and J. A. Laredo",
title = "{CrisisTracker}: Crowdsourced social media curation
for disaster awareness",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "4:1--4:13",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2260692",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sips:2013:CEB,
author = "R.-J. Sips and A. {van der Vlis} and R. Nagel and B.
Havers",
title = "A case for evidence-based levee management using
sensor technology",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "5:1--5:12",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2261213",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Osogami:2013:TSE,
author = "T. Osogami and T. Imamichi and H. Mizuta and T.
Suzumura and T. Ide",
title = "Toward simulating entire cities with behavioral models
of traffic",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "6:1--6:10",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2264906",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Treinish:2013:EHR,
author = "L. A. Treinish and A. P. Praino and J. P. Cipriani and
U. T. Mello and K. Mantripragada and L. C. Villa Real
and P. A. Sesini and V. Saxena and T. George and R.
Mittal",
title = "Enabling high-resolution forecasting of severe weather
and flooding events in {Rio de Janeiro}",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "7:1--7:11",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2263414",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ein-Dor:2013:ARM,
author = "L. Ein-Dor and Y. Goldschmidt and O. Lavi and G. E.
Miller and M. Ninio and D. Dillenberger",
title = "Analytics for resiliency in the mainframe",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "8:1--8:5",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2263891",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dillenberger:2013:CBM,
author = "D. Dillenberger and D. Petersen",
title = "A contrast between mainframe {Parallel Sysplex}
availability and selected distributed computing
availability solutions",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "9:1--9:14",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2266752",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Salapura:2013:RCC,
author = "V. Salapura and R. Harper and M. Viswanathan",
title = "Resilient cloud computing",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "10:1--10:12",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2266972",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Guerard:2013:EGP,
author = "J. B. Guerard and S. T. Rachev and B. P. Shao",
title = "Efficient global portfolios: Big data and investment
universes",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "11:1--11:11",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2272483",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2013:FC,
author = "Anonymous",
title = "[Front-cover]",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "??--??",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2013:TCa,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "??--??",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Paraszczak:2013:PDR,
author = "J. Paraszczak and H. Watanabe and P. Williams",
title = "Preface: Disaster recovery and resilient computing",
journal = j-IBM-JRD,
volume = "57",
number = "5",
pages = "??--??",
month = sep # "--" # oct,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:44 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zyuban:2013:IPD,
author = "V. Zyuban and S. A. Taylor and B. Christensen and A.
R. Hall and C. J. Gonzalez and J. Friedrich and F.
Clougherty and J. Tetzloff and R. Rao",
title = "{IBM POWER7+} design for higher frequency at fixed
power",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "1:1--1:18",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279597",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Floyd:2013:RPR,
author = "M. S. Floyd and A. Drake and N. S. Schwartz and R. W.
Berry and C. R. Lefurgy and M. Ware and K. Rajamani and
V. Zyuban and R. Willaman and R. M. Zgabay",
title = "Runtime power reduction capability of the {IBM
POWER7+} chip",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "2:1--2:17",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279598",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Blaner:2013:IPP,
author = "B. Blaner and B. Abali and B. M. Bass and S. Chari and
R. Kalla and S. Kunkel and K. Lauricella and R. Leavens
and J. J. Reilly and P. A. Sandon",
title = "{IBM POWER7+} processor on-chip accelerators for
cryptography and active memory expansion",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "3:1--3:16",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2280090",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Liberty:2013:THR,
author = "John S. Liberty and Adrian Barrera and David W.
Boerstler and Thomas B. Chadwick and Scott R. Cottier
and H. Peter Hofstee and Julie A. Rosser and Marty L.
Tsai",
title = "True hardware random number generation implemented in
the $ 32 $-nm {SOI POWER7+} processor",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "4:1--4:7",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279599",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/prng.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "hardware random-number generator; quantum thermal
noise; ring oscillator",
}
@Article{Jaramillo:2013:CSB,
author = "D. Jaramillo and N. Katz and B. Bodin and W. Tworek
and R. Smart and T. Cook",
title = "Cooperative solutions for Bring Your Own Device
{(BYOD)}",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "5:1--5:11",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279600",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cook:2013:MIA,
author = "T. Cook and D. Jaramillo and N. Katz and B. Bodin and
S. Cooper and C. H. Becker and R. Smart and C. Lu",
title = "Mobile innovation applications for the {BYOD}
enterprise user",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "6:1--6:10",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279637",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Castro:2013:EBY,
author = "P. C. Castro and J. W. Ligman and M. Pistoia and J.
Ponzo and G. S. Thomas and S. P. Wood and M. Baluda",
title = "Enabling Bring-Your-Own-Device using mobile
application instrumentation",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "7:1--7:11",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2279640",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Castro:2013:RAM,
author = "P. C. Castro and J. W. Ligman and M. Pistoia and J.
Ponzo and G. S. Thomas and U. Topkara",
title = "Runtime adaptive multi-factor authentication for
mobile devices",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "8:1--8:17",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2281123",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Malone:2013:MOD,
author = "C. V. Malone and E. J. Barkie and B. L. Fletcher and
N. Wei and A. Keren and A. Wyskida",
title = "{Mobile Optimized Digital Identity (MODI)}: A
framework for easier digital certificate use",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "9:1--9:11",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2283755",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sbirlea:2013:ADI,
author = "D. Sbirlea and M. G. Burke and S. Guarnieri and M.
Pistoia and V. Sarkar",
title = "Automatic detection of inter-application permission
leaks in {Android} applications",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "10:1--10:12",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2284403",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chencinski:2013:FSI,
author = "E. W. Chencinski and M. J. Anderson and L. Cleveland
and J. Coon and D. Craddock and R. E. Galbraith and T.
A. Gregg and T. B. Mathias and D. F. Moertl and K. J.
Oakes and M. Sabins and G. E. Sittmann and P. Sutton
and P. Szwed and G. A. Tressler and E. Tzortzatos and
A. D. Walls",
title = "Flash storage integration in the {IBM System z EC12}
{I/O} drawer",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "11:1--11:14",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2285294",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2013:C,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "??--??",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2013:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "??--??",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ritsko:2013:PMC,
author = "J. J. Ritsko",
title = "Preface: Mobile computing and {IBM POWER7+}
technologies",
journal = j-IBM-JRD,
volume = "57",
number = "6",
pages = "??--??",
month = nov # "--" # dec,
year = "2013",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:47 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ortiz-Yepes:2014:BSA,
author = "D. A. Ortiz-Yepes and R. J. Hermann and H. Steinauer
and P. Buhler",
title = "Bringing strong authentication and transaction
security to the realm of mobile devices",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "4:1--4:11",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2287810",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Visegrady:2014:SCV,
author = "T. Visegrady and S. Dragone and M. Osborne",
title = "Stateless cryptography for virtual environments",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "5:1--5:10",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2287811",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Whitmore:2014:TAS,
author = "J. Whitmore and S. Turpe and S. Triller and A. Poller
and C. Carlson",
title = "Threat analysis in the software development
lifecycle",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "6:1--6:13",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2288060",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kitayama:2014:ASP,
author = "H. Kitayama and S. Munetoh and K. Ohnishi and N.
Uramoto and Y. Watanabe",
title = "Advanced security and privacy in connected vehicles",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "7:1--7:9",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2288061",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ahmed:2014:ASA,
author = "M. Ahmed and M. Ahamad and T. Jaiswal",
title = "Augmenting security and accountability within the
{eHealth} Exchange",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "8:1--8:11",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2288068",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gkoulalas-Divanis:2014:TSH,
author = "A. Gkoulalas-Divanis and G. Loukides and J. Sun",
title = "Toward smarter healthcare: Anonymizing medical data to
support research studies",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "9:1--9:11",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2288173",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baentsch:2014:ISE,
author = "M. Baentsch and P. Buhler and L. Garces-Erice and T.
Gschwind and F. Horing and M. Kuyper and A. Schade and
P. Scotton and P. Urbanetz",
title = "{IBM Secure Enterprise Desktop}",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "10:1--10:11",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2289606",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Szakal:2014:OIS,
author = "A. R. Szakal and K. J. Pearsall",
title = "Open industry standards for mitigating risks to global
supply chains",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "11--113",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2285605",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gkoulalas-Divanis:2014:PPO,
author = "A. Gkoulalas-Divanis and P. Mac Aonghusa",
title = "Privacy protection in open information management
platforms",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "21--211",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2285853",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Himmel:2014:SDS,
author = "M. A. Himmel and F. Grossman",
title = "Security on distributed systems: Cloud security versus
traditional {IT}",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "31--313",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2013.2287591",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:FCa,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "??--??",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:TCa,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "??--??",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Palmer:2014:PCS,
author = "C. C. Palmer",
title = "Preface: Cybersecurity for a Smarter Planet",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "??--??",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Viveros:2014:MVP,
author = "M. S. Viveros",
title = "Message from the {Vice President, Cyber Security
Innovation}",
journal = j-IBM-JRD,
volume = "58",
number = "1",
pages = "??--??",
month = jan # "--" # feb,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Feb 15 16:52:52 MST 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Li:2014:SDE,
author = "C. Li and B. L. Brech and S. Crowder and D. M. Dias
and H. Franke and M. Hogstrom and D. Lindquist and G.
Pacifici and S. Pappe and B. Rajaraman and J. Rao and
R. P. Ratnaparkhi and R. A. Smith and M. D. Williams",
title = "Software defined environments: An introduction",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "1:1--1:11",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2298134",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kandiraju:2014:SDI,
author = "G. Kandiraju and H. Franke and M. D. Williams and M.
Steinder and S. M. Black",
title = "Software defined infrastructures",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "2:1--2:13",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2298133",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dixon:2014:SDN,
author = "C. Dixon and D. Olshefski and V. Jain and C. DeCusatis
and W. Felter and J. Carter and M. Banikazemi and V.
Mann and J. M. Tracey and R. Recio",
title = "Software defined networking to support the software
defined environment",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "3:1--3:14",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2300365",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baset:2014:TAO,
author = "S. A. Baset and L. Wang and B. C. Tak and C. Pham and
C. Tang",
title = "Toward achieving operational excellence in a cloud",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "4:1--4:11",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2298927",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Alba:2014:EAS,
author = "A. Alba and G. Alatorre and C. Bolik and A. Corrao and
T. Clark and S. Gopisetty and R. Haas and R. I. Kat and
B. S. Langston and N. S. Mandagere and D. Noll and S.
Padbidri and R. Routray and Y. Song and C. Tan and A.
Traeger",
title = "Efficient and agile storage management in software
defined environments",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "5:1--5:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2302381",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Azagury:2014:GBI,
author = "A. C. Azagury and R. Haas and D. Hildebrand and S. W.
Hunter and T. Neville and S. Oehme and A. Shaikh",
title = "{GPFS}-based implementation of a hyperconverged system
for software defined infrastructure",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "6:1--6:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2303321",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Seshadri:2014:SDJ,
author = "S. Seshadri and P. H. Muench and L. Chiu and I.
Koltsidas and N. Ioannou and R. Haas and Y. Liu and M.
Mei and S. Blinick",
title = "Software defined just-in-time caching in an enterprise
storage system",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "7:1--7:13",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2303595",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mega:2014:DCS,
author = "C. Mega and T. Waizenegger and D. Lebutsch and S.
Schleipen and J. M. Barney",
title = "Dynamic cloud service topology adaption for minimizing
resources while meeting performance goals",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "8:1--8:10",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2304771",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Breiter:2014:SDE,
author = "G. Breiter and M. Behrendt and M. Gupta and S. D.
Moser and R. Schulze and I. Sippli and T. Spatzier",
title = "Software defined environments based on {TOSCA} in
{IBM} cloud implementations",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "9:1--9:10",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2304772",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kalantar:2014:WLR,
author = "M. H. Kalantar and F. Rosenberg and J. Doran and T.
Eilam and M. D. Elder and F. Oliveira and E. C. Snible
and T. Roth",
title = "{Weaver}: Language and runtime for software defined
environments",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "10:1--10:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2304865",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arnold:2014:WOO,
author = "W. C. Arnold and D. J. Arroyo and W. Segmuller and M.
Spreitzer and M. Steinder and A. N. Tantawi",
title = "Workload orchestration and optimization for software
defined environments",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "11:1--11:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2304864",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mahindru:2014:SDU,
author = "R. Mahindru and R. Sarkar and M. Viswanathan",
title = "Software defined unified monitoring and management of
clouds",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "12:1--12:11",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2305313",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vernizzi:2014:TCF,
author = "G. Vernizzi and M. Y. Lanzerotti and J. Kujawski and
A. Weatherwax",
title = "Topological constraints for {E. F. Rent}'s work on
microminiature packaging and circuitry",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "13:1--13:17",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2307225",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fiorelli:2014:CCA,
author = "M. Fiorelli and M. T. Pazienza and A. Stellato and A.
Turbati",
title = "{CODA}: Computer-aided ontology development
architecture",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "14:1--14:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2307518",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nguyen:2014:HBD,
author = "H. Nguyen and L. Michel and J. D. Thompson and O.
Poch",
title = "Heterogeneous biological data integration with
declarative query language",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "15:1--15:12",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2309032",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:Ca,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "??--??",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:Cb,
author = "Anonymous",
title = "Cover 2",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "??--??",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "??--??",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:Cc,
author = "Anonymous",
title = "Cover 3",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "??--??",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Franke:2014:PSD,
author = "H. Franke and M. Hogstrom and D. Lindquist and B.
McCredie and S. Pappe",
title = "Preface: Software defined environments",
journal = j-IBM-JRD,
volume = "58",
number = "2--3",
pages = "??--??",
month = mar # "--" # may,
year = "2014",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Sep 9 11:20:32 MDT 2014",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:FCb,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "C1--C1",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2330427",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:FICa,
author = "Anonymous",
title = "[Front inside cover]",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "C2--C2",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2330429",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:TCc,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "1--2",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2336432",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ray:2014:PSF,
author = "B. K. Ray and K. Saxton",
title = "Preface: Smarter finance",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "1--3",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2329385",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rios:2014:FSF,
author = "J. Rios and K. Anikeev and M. J. Richard and S. Kapoor
and B. K. Ray and C. Toft-Nielsen and D. Subramanian
and C. Jiang and Y. Drissi and J. Fu",
title = "A framework for strategic financial risk management",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "1:1--1:11",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2320833",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Computational modeling;
Probabilistic logic; Probability distribution; Risk
management; Strategic planning",
}
@Article{Horrall:2014:ERI,
author = "D. Horrall and Y. Siddiqui",
title = "Evaluating risk: {IBM}'s Country Financial Risk and
Treasury Risk Scorecards",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "2:1--2:9",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2321072",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Context awareness; Current measurement; Economic
indicators; Macroeconomics; Risk management",
}
@Article{Duch:2014:NAO,
author = "K. Duch and Y. Jiang and A. Kreinin",
title = "New approaches to operational risk modeling",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "3:1--3:9",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2321851",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Banking; Computational modeling; Economics; Finances;
Modeling; Poisson equations; Risk management",
}
@Article{King:2014:MFR,
author = "A. J. King and A. Orani and F. N. Parr",
title = "Middleware for financial risk data aggregation",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "4:1--4:10",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2322272",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Banking; Cost accounting; Data models; Globalization;
Information processing; Investment; Law; Middleware;
Regulators; Risk management",
}
@Article{Mausser:2014:CER,
author = "H. Mausser and O. Romanko",
title = "Computing equal risk contribution portfolios",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "5:1--5:12",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2325291",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Approximation algorithms; Computational modeling;
Linear programming; Portfolios; Quadratic programming;
Risk management",
}
@Article{Guerard:2014:REC,
author = "J. B. Guerard and H. Markowitz and G. Xu",
title = "The role of effective corporate decisions in the
creation of efficient portfolios",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "6:1--6:11",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2326591",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Data mining; Decision making; Finances; Investment;
Mathematical model; Strategic planning",
}
@Article{Vogt:2014:ASP,
author = "A. Vogt and E. R. Mattfeldt and G. Satzger and L.
Luders and M. Piper and O. Gehb and W. L. Jones",
title = "Analytical support for predicting cost in complex
service delivery environments",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "7:1--7:10",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2327301",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Data models; Forecasting;
Globalization; Predictive models; Risk management",
}
@Article{Lu:2014:WMR,
author = "Y. Lu and M. Sharma and M. S. Squillante",
title = "Workforce management: Risk-based financial planning
and capacity provisioning",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "8:1--8:10",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2327709",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Approximation methods; Capacity planning; Finance;
Planning; Risk management; Stochastic processes;
Strategic planning; Uncertainty",
}
@Article{Amemiya:2014:AER,
author = "Y. Amemiya and H. Yang and K. Anikeev",
title = "An approach to enterprise revenue forecasting as a
decision support system",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "9:1--9:7",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2328931",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Business; Competitive intelligence; Decision making;
Decision support systems; Economics; Forecasting;
Predictive models",
}
@Article{Albrecht:2014:SFL,
author = "S. Albrecht and A. Bonti and J. Dhaliwal and F. M.
Giaimo and J. von Kanel and S. Pandey and A. Phan and
Y. Wang",
title = "Smarter Financial Life: Rethinking personal financial
planning",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "10:1--10:10",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2329384",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Banking; Insurance; Investment;
Risk management; Strategic planning; Visualization",
}
@Article{Anonymous:2014:BICa,
author = "Anonymous",
title = "[Back inside cover]",
journal = j-IBM-JRD,
volume = "58",
number = "4",
pages = "C3--C3",
month = jul,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2330430",
ISSN = "0018-8646",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 08:50:21 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:FCc,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "C1--C1",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2358963",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:FICb,
author = "Anonymous",
title = "[Front inside cover]",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "C2--C2",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2363987",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2014:TCd,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "1--1",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2363988",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dong:2014:PSC,
author = "J. Dong and R. Lougee and C. Narayanaswami",
title = "Preface: Smarter Commerce",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "1--5",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2359096",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Takahashi:2014:MPM,
author = "R. Takahashi and T. Yoshizumi and H. Mizuta and N. Abe
and R. L. Kennedy and V. J. Jeffs and R. Shah and R. H.
Crites",
title = "Multi-period marketing-mix optimization with response
spike forecasting",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "1:1--1:13",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2337131",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Budgets; Consumer behavior; Consumer purchases;
Decision making; Economics; Forecasting; Market
research; Risk assessment; Sales and marketing",
}
@Article{Sun:2014:DPC,
author = "W. Sun and P. Murali and A. Sheopuri and Y. Chee",
title = "Designing promotions: Consumers' surprise and
perception of discounts",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "2:1--2:10",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2337691",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Advertising; Behavioral science; Consumer behavior;
Consumer products; Market research; Sales and
marketing",
}
@Article{Yaeli:2014:UCB,
author = "A. Yaeli and P. Bak and G. Feigenblat and S. Nadler
and H. Roitman and G. Saadoun and H. J. Ship and D.
Cohen and O. Fuchs and S. Ofek-Koifman and T.
Sandbank",
title = "Understanding customer behavior using indoor location
analysis and visualization",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "3:1--3:12",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2337552",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Behavioral sciecne; Consumer behavior; Consumer
purchases; Electronic commerce; Market research; Mobile
communication; Sales and marketing; Social network
services",
}
@Article{Sun:2014:IFB,
author = "N. Sun and J. G. Morris and J. Xu and X. Zhu and M.
Xie",
title = "{iCARE}: A framework for big data-based banking
customer analytics",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "4:1--4:9",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2337118",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Banking industry; Big data; Data
models; Electronic commerce; Finance",
}
@Article{He:2014:IBR,
author = "M. He and C. Ren and H. Zhang",
title = "Intent-based recommendation for {B2C} e-commerce
platforms",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "5:1--5:10",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2338091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Consumer behavior; Consumer purchases; Electronic
commerce; Internet; Recommender systems; Sales and
marketing",
}
@Article{Bao:2014:PMU,
author = "J. Bao and A. Deshpande and S. McFaddin and C.
Narayanaswami",
title = "Partner-marketing using geo-social media data for
smarter commerce",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "6:1--6:12",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2344514",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Consumer behavior; Consumer products; Electronic
commerce; Globalization; Market opportunities; Market
research; Sales and marketing; Social network
services",
}
@Article{Buckley:2014:SMC,
author = "S. Buckley and M. Ettl and P. Jain and R. Luss and M.
Petrik and R. K. Ravi and C. Venkatramani",
title = "Social media and customer behavior analytics for
personalized customer engagements",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "7:1--7:12",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2344515",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Behavioral science; Consumer behavior; Customer
services; Market research; Natural language processing;
Social network services; Text analytics",
}
@Article{Tian:2014:PRS,
author = "C. H. Tian and Y. Wang and W. T. Mo and F. C. Huang
and W. S. Dong and J. Huang",
title = "Pre-release sales forecasting: A model-driven context
feature extraction approach",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "8:1--8:13",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2344531",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "China; Context modeling; Feature extraction;
Forecasting; Market research; Motion pictures; Sales
and marketing; Semantics; Social network services",
}
@Article{Cao:2014:SAT,
author = "H. Cao and W. S. Dong and L. S. Liu and C. Y. Ma and
W. H. Qian and J. W. Shi and C. H. Tian and Y. Wang and
D. Konopnicki and M. Shmueli-Scheuer and D. Cohen and
N. Modani and H. Lamba and A. Dwivedi and A. A.
Nanavati and M. Kumar",
title = "{SoLoMo} analytics for telco {Big Data} monetization",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "9:1--9:13",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2336177",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Algorithm design and analysis; Big data; Consumer
behavior; Customer services; Electronic commerce;
Internet; Mobile communication; Social network
services",
}
@Article{Desmond:2014:SAP,
author = "M. Desmond and H. L. Guo and F. F. Heath and S. Bao
and E. Khabiri and S. Krasikov and N. Modani and S.
Nagar and M. Ohno and H. Srinivasan and H. Takeuchi and
R. Vaculin and S. W. Zhao and T. Hamid",
title = "A social analytics platform for smarter commerce
solutions",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "10:1--10:14",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2346262",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Behavioral science; Consumer behavior; Customer
purchases; Electronic commerce; Internet; Sales and
marketing; Social factors",
}
@Article{Schlenker:2014:OWS,
author = "H. Schlenker and R. Kluge and J. Koehl",
title = "Optimization of the worldwide supply chain at
{Continental Tires}: A case study",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "11:1--11:11",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2345934",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Business; Mathematical model; Product development;
Sales and marketing; Strategic planning; Supply and
demand; Supply chain management; Tires",
}
@Article{Kawas:2014:UFT,
author = "B. Kawas and A. Koc and M. Laumanns and C. Lee and R.
Marinescu and M. Mevissen and N. Taheri and S. A. van
den Heever and R. Verago",
title = "Unified framework and toolkit for commerce
optimization under uncertainty",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "12:1--12:13",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2346071",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Decision making; Electronic commerce; Scheduling;
Strategic planning; Supply and demand; Uncertainty;
Visual analytics",
}
@Article{Yesudas:2014:IOD,
author = "M. Yesudas and G. Menon and V. Ramamurthy",
title = "Intelligent operational dashboards for smarter
commerce using big data",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "13:1--13:10",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2346131",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Big data; Business; Consumer behavior; Consumer
purchases; Data models; Database management; Electronic
commerce; Sales and marketing; Supply chain
management",
}
@Article{Lotlikar:2014:RTC,
author = "R. M. Lotlikar and P. N. Pachigolla and D.
Miller-Davie and S. Godbole",
title = "Real-time customer probing and decision support in a
call center",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "14:1--14:11",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2346659",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Call centers; Consumer behavior; Contact centers; Data
models; Market opportunities; Market research;
Real-time systems; Sales and marketing",
}
@Article{Jamison:2014:ACE,
author = "J. Jamison and C. Snow",
title = "An architecture for customer experience management
based on the {Internet of Things}",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "15:1--15:11",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2346593",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Consumer behavior; Consumer products; Customer
services; Electronic commerce; Internet of things;
Investments; Market research; Network architecture",
}
@Article{Yesudas:2014:CBM,
author = "M. Yesudas and S. Gupta and H. Ramamurthy",
title = "Cloud-based mobile commerce for grocery purchasing in
developing countries",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "16:1--16:7",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2352471",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Business; Cloud computing; Consumer behavior;
Electronic commerce; Handheld devices; Market
opportunities; Mobile communication; Sales and
marketing; Smart phones",
}
@Article{Ram:2014:OSI,
author = "R. Ram and Y. Peres",
title = "Online shop for integrated software, hardware, and
human services",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "17:1--17:10",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2352473",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Economics; Europe; Integrated services; Internet;
Market research; Online services; Social factors;
Social network services",
}
@Article{OSullivan:2014:ADM,
author = "P. O'Sullivan and G. Thompson and A. Clifford",
title = "Applying data models to big data architectures",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "18:1--18:11",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2352474",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Big data; Business; Data models; Database management;
Transaction processing",
}
@Article{Rojahn:2014:TCW,
author = "T. Rojahn and R. Lebsack and C. Pavlovski",
title = "Toward a computing workload classifier",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "19:1--19:12",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2352491",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Business; Computers; Information technology; Internet;
Market research; Mobile communication; Technology
forecasting; Ubiquitous computing",
}
@Article{Anonymous:2014:BICb,
author = "Anonymous",
title = "[back inside cover]",
journal = j-IBM-JRD,
volume = "58",
number = "5/6",
pages = "C3--C3",
month = sep,
year = "2014",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2014.2363989",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jan 29 07:46:48 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sinharoy:2015:AFI,
author = "B. Sinharoy and R. Swanberg and N. Nayar and B. Mealey
and J. Stuecheli and B. Schiefer and J. Leenstra and J.
Jann and P. Oehler and D. Levitan and S. Eisen and D.
Sanner and T. Pflueger and C. Lichtenau and W. E. Hall
and T. Block",
title = "Advanced features in {IBM POWER8} systems",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "1:1--1:18",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:TCa,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "1--2",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pattnaik:2015:PIP,
author = "P. Pattnaik and J. Moreira and D. W. Victor",
title = "Preface: {IBM POWER8} technology",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "1--4",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sinharoy:2015:IPP,
author = "B. Sinharoy and J. A. {Van Norstrand} and R. J.
Eickemeyer and H. Q. Le and J. Leenstra and D. Q.
Nguyen and B. Konigsburg and K. Ward and M. D. Brown
and J. E. Moreira and D. Levitan and S. Tung and D.
Hrusecky and J. W. Bishop and M. Gschwind and M.
Boersma and M. Kroener and M. Kaltenbach and T.
Karkhanis and K. M. Fernsler",
title = "{IBM POWER8} processor core microarchitecture",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "2:1--2:21",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Starke:2015:CMS,
author = "W. J. Starke and J. Stuecheli and D. M. Daly and J. S.
Dodson and F. Auernhammer and P. M. Sagmeister and G.
L. Guthrie and C. F. Marino and M. Siegel and B.
Blaner",
title = "The cache and memory subsystems of the {IBM POWER8}
processor",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "3:1--3:13",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cahill:2015:IPS,
author = "J. J. Cahill and T. Nguyen and M. Vega and D. Baska
and D. Szerdi and H. Pross and R. X. Arroyo and H.
Nguyen and M. J. Mueller and D. J. Henderson and J.
Moreira",
title = "{IBM Power Systems} built with the {POWER8}
architecture and processors",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "4:1--4:10",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Freeman:2015:POG,
author = "G. Freeman and P. Chang and E. R. Engbrecht and K. J.
Giewont and D. F. Hilscher and M. Lagus and T. J.
McArdle and B. Morgenfeld and S. Narasimha and J. P.
Norum and K. A. Nummy and P. Parries and G. Wang and J.
K. Winslow and P. Agnello and R. Malik",
title = "Performance-optimized gate-first $ 22$-nm {SOI}
technology with embedded {DRAM}",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "5:1--5:14",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mericas:2015:IPP,
author = "A. Mericas and N. Peleg and L. Pesantez and S. B.
Purushotham and P. Oehler and C. A. Anderson and B. A.
King-Smith and M. Anand and J. A. Arnold and B. Rogers
and L. Maurice and K. Vu",
title = "{IBM POWER8} performance features and evaluation",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "6:1--6:10",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stuecheli:2015:CCA,
author = "J. Stuecheli and B. Blaner and C. R. Johns and M. S.
Siegel",
title = "{CAPI}: A {Coherent Accelerator Processor Interface}",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "7:1--7:7",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Le:2015:TMS,
author = "H. Q. Le and G. L. Guthrie and D. E. Williams and M.
M. Michael and B. G. Frey and W. J. Starke and C. May
and R. Odaira and T. Nakaike",
title = "Transactional memory support in the {IBM POWER8}
processor",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "8:1--8:14",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zyuban:2015:IPC,
author = "V. Zyuban and J. Friedrich and D. M. Dreps and J.
Pille and D. W. Plass and P. J. Restle and Z. T. Deniz
and M. M. Ziegler and S. Chu and S. Islam and J.
Warnock and R. Philhower and R. M. Rao and G. S. Still
and D. W. Shan and E. Fluhr and J. Paredes and D. F.
Wendel and C. J. Gonzalez and D. Hogenmiller and R.
Puri and S. A. Taylor and S. D. Posluszny",
title = "{IBM POWER8} circuit design and energy optimization",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "9:1--9:16",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Raghavan:2015:IPP,
author = "R. Raghavan and R. J. Eickemeyer and A. C. Sawdey and
J. B. Griswell and D. Parikh and S. Ramani and D. M.
Daly and N. Ni and B. Rogers and A. Mericas and L.
Maurice and K. Vu",
title = "{IBM POWER8} performance and energy modeling",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "10:1--10:10",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schubert:2015:SIP,
author = "K. Schubert and J. M. Ludden and S. Ayub and J.
Behrend and B. Brock and F. Copty and S. M. German and
O. Hershkovitz and H. Horbach and J. R. Jackson and K.
Keuerleber and J. Koesters and L. S. Leitner and G. B.
Meil and C. Meissner and R. Morad and A. Nahir and V.
Paruthi and R. D. Peterson and R. R. Pratt and M. Rimon
and J. A. Schumann",
title = "Solutions to {IBM POWER8} verification challenges",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "11:1--11:17",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dusanapudi:2015:DPS,
author = "M. Dusanapudi and S. Fields and M. S. Floyd and G. L.
Guthrie and R. Kalla and S. Kapoor and L. S. Leitner
and C. F. Marino and J. J. McGill and A. Nahir and K.
Reick and H. Shen and K. L. Wright",
title = "Debugging post-silicon fails in the {IBM POWER8}
bring-up lab",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "12:1--12:10",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:BIC,
author = "Anonymous",
title = "[Back inside cover]",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "c3--c3",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:FCa,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "c1--c1",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:FIC,
author = "Anonymous",
title = "[Front inside cover]",
journal = j-IBM-JRD,
volume = "59",
number = "1",
pages = "c2--c2",
month = jan # "\slash " # feb,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Mar 6 16:48:56 MST 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Abedini:2015:GFM,
author = "M. Abedini and N. C. F. Codella and J. H. Connell and
R. Garnavi and M. Merler and S. Pankanti and J. R.
Smith and T. Syeda-Mahmood",
title = "A generalized framework for medical image
classification and recognition",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "1:1--1:18",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:TCb,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "1--2",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Soffer:2015:PMV,
author = "A. Soffer and H. Su",
title = "Preface: Multimedia and visual analytics",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "1--5",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kisilev:2015:MIA,
author = "P. Kisilev and E. Walach and E. Barkan and B. Ophir
and S. Alpert and S. Y. Hashoul",
title = "From medical image to automatic medical report
generation",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "2:1--2:7",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Marder:2015:UIA,
author = "M. Marder and S. Harary and A. Ribak and Y. Tzur and
S. Alpert and A. Tzadok",
title = "Using image analytics to monitor retail store
shelves",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "3:1--3:11",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ratha:2015:BDA,
author = "N. K. Ratha and J. H. Connell and S. Pankanti",
title = "{Big Data} approach to biometric-based identity
analytics",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "4:1--4:11",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lin:2015:MCA,
author = "C. Lin and S. Pankanti and G. Ashour and D. Porat and
J. R. Smith",
title = "Moving camera analytics: Emerging scenarios,
challenges, and applications",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "5:1--5:10",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Su:2015:LFB,
author = "F. Su and W. Jiang and J. Zhang and H. Wang and M.
Zhang",
title = "A local features-based approach to all-sky image
prediction",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "6:1--6:10",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Smith:2015:MSL,
author = "J. R. Smith and L. Cao and N. C. F. Codella and M. L.
Hill and M. Merler and Q. Nguyen and E. Pring and R. A.
Uceda-Sosa",
title = "Massive-scale learning of image and video semantic
concepts",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "7:1--7:13",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chang:2015:FDI,
author = "H. Chang and I. H. Jiang and H. P. Hofstee and D.
Jamsek and G. Nam",
title = "Feature detection for image analytics via {FPGA}
acceleration",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "8:1--8:10",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Andreopoulos:2015:VSN,
author = "A. Andreopoulos and B. Taba and A. S. Cassidy and R.
Alvarez-Icaza and M. D. Flickner and W. P. Risk and A.
Amir and P. A. Merolla and J. V. Arthur and D. J. Berg
and J. A. Kusnitz and P. Datta and S. K. Esser and R.
Appuswamy and D. R. Barch and D. S. Modha",
title = "Visual saliency on networks of neurosynaptic cores",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "9:1--9:16",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bak:2015:VAM,
author = "P. Bak and H. J. Ship and A. Yaeli and Y. Nardi and E.
Packer and G. Saadoun and J. Bnayahu and L.
Peterfreund",
title = "Visual analytics for movement behavior in traffic and
transportation",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "10:1--10:12",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Erickson:2015:SCC,
author = "T. Erickson and J. B. Ellis and K. P. McAuliffe",
title = "Supporting coordinated care: Designing social context
visualizations for care teams",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "11:1--11:11",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kandogan:2015:JTI,
author = "E. Kandogan",
title = "Just-in-time interactive analytics: Guiding visual
exploration of data",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "12:1--12:10",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Borrel:2015:VID,
author = "P. Borrel and B. Laha",
title = "Visual Integration: A dynamic approach to the
interactive combination of disparate data",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "13:1--13:12",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dunne:2015:RMF,
author = "C. Dunne and S. I. Ross and B. Shneiderman and M.
Martino",
title = "Readability metric feedback for aiding node-link
visualization designers",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "14:1--14:16",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{DAmora:2015:DCA,
author = "B. D'Amora and G. C. Fossum",
title = "A data-centric algorithm for automated detection and
extraction of isoparametric surfaces",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "15:1--15:8",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cavalin:2015:SAR,
author = "P. R. Cavalin and M. A. C. Gatti and T. G. P. Moraes
and F. S. Oliveira and C. S. Pinhanez and A. Rademaker
and R. A. de Paula",
title = "A scalable architecture for real-time analysis of
microblogging data",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "16:1--16:10",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nair:2015:AMC,
author = "R. Nair and S. F. Antao and C. Bertolli and P. Bose
and J. R. Brunheroto and T. Chen and C. Cher and C. H.
A. Costa and J. Doi and C. Evangelinos and B. M.
Fleischer and T. W. Fox and D. S. Gallo and L. Grinberg
and J. A. Gunnels and A. C. Jacob and P. Jacob and H.
M. Jacobson and T. Karkhanis and C. Kim and J. H.
Moreno and J. K. O'Brien and M. Ohmacht and Y. Park and
D. A. Prener and B. S. Rosenburg and K. D. Ryu and O.
Sallenave and M. J. Serrano and P. D. M. Siegl and K.
Sugavanam and Z. Sura",
title = "{Active Memory Cube}: A processing-in-memory
architecture for exascale systems",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "17:1--17:14",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:FCb,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "59",
number = "2--3",
pages = "C1",
month = mar # "\slash " # may,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Aug 9 17:17:56 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Curran:2015:IZM,
author = "B. W. Curran and C. Jacobi and J. J. Bonanno and D. A.
Schroter and K. J. Alexander and A. Puranik and M. M.
Helms",
title = "The {IBM z13} multithreaded microprocessor",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "1:1--1:13",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2418591",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/multithreading.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:TCc,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "1--2",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 21 11:38:12 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kostenko:2015:PIZ,
author = "W. P. Kostenko",
title = "Preface: {IBM z13} Technology and Design",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "1--4",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2446873",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schwarz:2015:SAB,
author = "E. M. Schwarz and R. B. Krishnamurthy and C. J. Parris
and J. D. Bradbury and I. M. Nnebe and M. Gschwind",
title = "The {SIMD} accelerator for business analytics on the
{IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "2:1--2:16",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2426576",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Walters:2015:IZP,
author = "C. R. Walters and P. Mak and D. P. D. Berger and M. A.
Blake and T. C. Bronson and K. D. Klapproth and A. J.
O'Neill and R. J. Sonnelitter and V. K. Papazova",
title = "The {IBM z13} processor cache subsystem",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "3:1--3:14",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2428591",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meaney:2015:IZM,
author = "P. J. Meaney and L. D. Curley and G. D. Gilda and M.
R. Hodges and D. J. Buerkle and R. D. Siegl and R. K.
Dong",
title = "The {IBM z13} memory subsystem for big data",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "4:1--4:11",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2429031",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chencinski:2015:AIZ,
author = "E. W. Chencinski and C. Colonna and D. Craddock and J.
R. Flanagan and J. M. Hoke and M. Klein and G. Kuch and
P. Sciuto and R. M. Sczepczenski and H. M.
Yudenfriend",
title = "Advances in the {IBM z13} {I/O} function and
capability",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "5:1--5:10",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2429032",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arnold:2015:NGH,
author = "T. W. Arnold and M. Check and E. A. Dames and J. Dayka
and S. Dragone and D. Evans and W. Santiago Fernandez
and M. D. Hocker and R. Kisley and T. E. Morris and J.
Petreshock and K. Werner",
title = "The next generation of highly reliable and secure
encryption for the {IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "6:1--6:13",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2430071",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sofia:2015:IHP,
author = "A. T. Sofia and C. C. Lewis and C. Jacobi and D. A.
Jamsek and D. F. Riedy and J. Vogt and P. Sutton and R.
W. {St. John}",
title = "Integrated high-performance data compression in the
{IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "7:1--7:10",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2430091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Surman:2015:IZS,
author = "D. H. Surman",
title = "The {IBM z Systems Coupling Facility} exploitation of
storage-class memory",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "8:1--8:9",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2430052",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Clarke:2015:ARA,
author = "W. J. Clarke and L. C. Alves and K. W. Kark and R. K.
Overton and M. J. Snihur",
title = "Advancing reliability, availability, and
serviceability with the {IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "9:1--9:11",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2432651",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kostenko:2015:IZE,
author = "W. P. Kostenko and D. W. Demetriou and G. F. Goth",
title = "{IBM z13}: Energy efficiency, increased environmental
range, and flexible data center characteristics",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "10:1--10:9",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2432652",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Axnix:2015:IZF,
author = "C. Axnix and G. Bayer and H. Bohm and J. von Buttlar
and M. S. Farrell and L. C. Heller and J. P. Kubala and
S. E. Lederer and R. Mansell and A. Nunez Mencias and
S. Usenbinz",
title = "{IBM z13} firmware innovations for simultaneous
multithreading and {I/O} virtualization",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "11:1--11:11",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2435494",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 21 11:38:12 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/multithreading.bib;
https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Troester:2015:IIF,
author = "M. Troester and P. J. Clas and M. Kuenzel and I.
Leoshkevich and P. Schulz and B. D. Valentine and M.
Becht and V. Gorbik and P. M. Lobo and O. Marquardt and
S. Stork and T. Webel",
title = "Innovations in infrastructure firmware for the {IBM
z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "12:1--12:11",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2444733",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Becker:2015:EPI,
author = "W. D. Becker and H. Harrer and A. Huber and W. L.
Brodsky and R. Krabbenhoft and M. A. Cracraft and D.
Kaller and G. Edlund and T. Strach",
title = "Electronic packaging of the {IBM z13} processor
drawer",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "13:1--13:12",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2445031",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Torok:2015:MPP,
author = "J. G. Torok and F. E. Bosco and G. F. Goth and J. J.
Loparco and M. Peets and D. Porter and S. G. Shevach
and B. C. Tucker and A. C. VanDeventer and X. Wei and
P. A. Wendling and Y. Yu and R. J. Zoodsma",
title = "Mechanical packaging, power, and cooling design for
the {IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "14:1--14:15",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2446031",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Warnock:2015:IZC,
author = "J. Warnock and C. Berry and M. H. Wood and L. Sigal
and Y. Chan and G. Mayer and M. Mayo and Y. Chan and F.
Malgioglio and G. Strevig and C. Nagarajan and S. Carey
and G. Salem and F. Schroeder and H. H. Smith and D.
Phan and R. H. Nigaglioni and T. Strach and M. M.
Ziegler and N. Fricke and K. Lind and J. L. Neves and
S. H. Rangarajan and J. P. Surprise and J. M. Isakson
and J. Badar and D. Malone and D. W. Plass and A.
Aipperspach and D. F. Wendel and R. M. Averill and R.
Puri",
title = "{IBM z13} circuit design and methodology",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "15:1--15:15",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2446871",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webel:2015:RPM,
author = "T. Webel and P. M. Lobo and R. Bertran and G. M. Salem
and M. Allen-Ware and R. Rizzolo and S. M. Carey and T.
Strach and A. Buyuktosunoglu and C. Lefurgy and P. Bose
and R. Nigaglioni and T. Slegel and M. S. Floyd and B.
W. Curran",
title = "Robust power management in the {IBM z13}",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "16:1--16:12",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2446872",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:FCc,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "59",
number = "4--5",
pages = "c1--c1",
month = jul # "\slash " # sep,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Oct 21 11:38:12 MDT 2015",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Basson:2015:PTE,
author = "S. Basson and S. V. Nitta and B. Sengupta",
title = "Preface: Technologies for Educational Transformation",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "0:1--0.4",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:33:24 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Neti:2015:MIE,
author = "C. Neti and M. Naghshineh and K. Frase",
title = "Message from {IBM Executives} on {``Technologies for
Educational Transformation''}",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "0:1--0:2",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:33:24 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Koch:2015:AAC,
author = "F. L. Koch and M. D. de Assuncao and C. H. Cardonha
and M. A. S. Netto and T. T. Primo",
title = "An architecture and algorithm for context-aware
resource allocation for digital teaching platforms",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "1:1--1:9",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2452783",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:TC,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "1--2",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:33:24 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cardonha:2015:TPS,
author = "C. H. Cardonha and R. L. Guimaraes and A. Mattos and
J. Nogima and P. Avegliano and D. Gallo and R. Herrmann
and S. Borger",
title = "Toward a platform to support vocational training of
people with disabilities",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "2:1--2:7",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2453021",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Contractor:2015:SLC,
author = "D. Contractor and S. Negi and K. Popat and S. Ikbal
and B. Prasad and S. Vedula and S. Kakaraparthy and B.
Sengupta and V. Kumar",
title = "Smarter learning content management using the
{Learning Content Hub}",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "3:1--3:9",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2455691",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reddy:2015:PLP,
author = "V. K. Reddy and L. Said and B. Sengupta and M. Chetlur
and J. P. Costantino and A. Gopinath and S. Flynt and
P. Balunaini and S. Vedula",
title = "{Personalized Learning Pathways}: Enabling
intervention creation and tracking",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "4:1--4:14",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2456711",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ikbal:2015:EPR,
author = "S. Ikbal and A. Tamhane and B. Sengupta and M. Chetlur
and S. Ghosh and J. Appleton",
title = "On early prediction of risks in academic performance
for students",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "5:1--5:14",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2458631",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Codish:2015:DPE,
author = "D. Codish and G. Ravid",
title = "Detecting playfulness in educational gamification
through behavior patterns",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "6:1--6:14",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2459651",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rafaeli:2015:NSD,
author = "S. Rafaeli and C. Kent",
title = "Network-structured discussions for collaborative
concept mapping and peer learning",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "7:1--7:13",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2461091",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mutahi:2015:SBL,
author = "J. Mutahi and O. Bent and A. Kinai and K. Weldemariam
and B. Sengupta and D. Contractor",
title = "Seamless blended learning using the {Cognitive
Learning Companion}: A systemic view",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "8:1--8:13",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2463591",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Woolf:2015:MES,
author = "B. Park Woolf and I. Arroyo",
title = "A mentor for every student: One challenge for
instructional software",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "9:1--9:13",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2463611",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sundararajan:2015:DEI,
author = "S. C. Sundararajan and S. V. Nitta",
title = "Designing engaging intelligent tutoring systems in an
age of cognitive computing",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "10:1--10:9",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2464085",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:Ca,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "??--??",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:33:24 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:Cb,
author = "Anonymous",
title = "Cover 2",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "??--??",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:33:24 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2015:Cc,
author = "Anonymous",
title = "Cover 3",
journal = j-IBM-JRD,
volume = "59",
number = "6",
pages = "??--??",
month = nov # "\slash " # dec,
year = "2015",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 08:30:50 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Singhee:2016:PNG,
author = "A. Singhee and U. Finkler and S. Hirsch and M. A.
Lavin and F. Heng and A. P. Kumar and J. M. Qu and E.
Pelletier",
title = "A platform for the next generation of smarter energy
applications",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "1:1--1:15",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2482318",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "1--2",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Heng:2016:IAS,
author = "F. Heng and K. Zhang and A. Goyal and H. Chaudhary and
S. Hirsch and Y. Kim and M. A. Lavin and A. Raman",
title = "Integrated analytics system for electric industry
asset management",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "2:1--2:12",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2475955",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Reinprecht:2016:EEE,
author = "N. B. Reinprecht and G. White and M. Peters",
title = "Enabling {European} electrical transmission and
distribution smart grids by standards",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "3:1--3:11",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2482878",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Goyal:2016:AHM,
author = "A. Goyal and E. Aprilia and G. Janssen and Y. Kim and
T. Kumar and R. Mueller and D. Phan and A. Raman and J.
Schuddebeurs and J. Xiong and R. Zhang",
title = "Asset health management using predictive and
prescriptive analytics for the electric power grid",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "4:1--4:14",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2475935",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Treinish:2016:ECM,
author = "L. A. Treinish and J. P. Cipriani and A. Praino and A.
Singhee and H. Wang and M. Sinn and V. Lonij and J.
Fiot and B. Chen",
title = "Enabling coupled models to predict the business impact
of weather on electric utilities",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "5:1--5:10",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2489478",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Singhee:2016:OPE,
author = "A. Singhee and Z. Li and A. Koc and H. Wang and J. P.
Cipriani and Y. Kim and A. P. Kumar and L. A. Treinish
and R. Mueller and G. Labut and R. A. Foltman and G. M.
Gauthier",
title = "{OPRO}: Precise emergency preparedness for electric
utilities",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "6:1--6:15",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2494999",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Khabibrakhmanov:2016:USE,
author = "I. Khabibrakhmanov and S. Lu and H. F. Hamann and K.
Warren",
title = "On the usefulness of solar energy forecasting in the
presence of asymmetric costs of errors",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "7:1--7:6",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2495001",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Warren:2016:MUE,
author = "K. Warren and R. Ambrosio and B. Chen and Y. H. Fu and
S. Ghosh and D. Phan and M. Sinn and C. H. Tian and C.
Visweswariah",
title = "Managing uncertainty in electricity generation and
demand forecasting",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "8:1--8:13",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2496822",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Katz:2016:SEP,
author = "J. S. Katz and P. G. Allor and S. A. Dougherty and S.
P. Duffy and S. Riccetti and H. D. Chantz and M. Kisch
and B. S. Oxford and J. L. Snowdon",
title = "Securing the electric power infrastructure",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "9:1--9:13",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2498819",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Basu:2016:SAE,
author = "C. Basu and M. Padmanaban and S. Guillon and L.
Cauchon and M. {De Montigny} and I. Kamwa",
title = "Situational awareness for the electrical power grid",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "10:1--10:11",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2498818",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kim:2016:AUC,
author = "Y. Kim and A. Aravkin and H. Fei and A. Zondervan and
M. Wolf",
title = "Analytics for understanding customer behavior in the
energy and utility industry",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "11:1--11:13",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2503988",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:Ca,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "60",
number = "1",
pages = "??--??",
month = jan # "\slash " # feb,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Jan 19 07:54:29 MST 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Isci:2016:PMC,
author = "C. Isci and V. Salapura and M. Vukovic",
title = "Preface: Managed cloud services",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "0:1--0:4",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hwang:2016:AOF,
author = "J. Hwang and K. Bai and M. Tacci and M. Vukovic and N.
Anerousis",
title = "Automation and orchestration framework for large-scale
enterprise cloud migration",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "1:1--1:12",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2511810",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:TCb,
author = "Anonymous",
title = "Table of contents",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "1--2",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:2016:ASC,
author = "H. Chen and A. Turk and S. S. Duri and C. Isci and A.
K. Coskun",
title = "Automated system change discovery and management in
the cloud",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "2:1--2:10",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2511811",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Salapura:2016:EEL,
author = "V. Salapura and R. Mahindru",
title = "Enabling enterprise-level workloads in the
enterprise-class cloud",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "3:1--3:8",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2513719",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Beaty:2016:MSA,
author = "K. A. Beaty and J. M. Chow and R. L. F. Cunha and K.
K. Das and M. F. Hulber and A. Kundu and V. Michelini
and E. R. Palmer",
title = "Managing sensitive applications in the public cloud",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "4:1--4:13",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2513720",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Almasi:2016:TBH,
author = "G. Alm{\'a}si and J. G. Casta{\~n}os and H. Franke and
M. A. L. Silva",
title = "Toward building highly available and scalable
{OpenStack} clouds",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "5:1--5:10",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2015.2513721",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cash:2016:MII,
author = "S. Cash and V. Jain and L. Jiang and A. Karve and J.
Kidambi and M. Lyons and T. Mathews and S. Mullen and
M. Mulsow and N. Patel",
title = "Managed infrastructure with {IBM Cloud OpenStack
Services}",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "6:1--6:12",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2515418",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gheith:2016:IBM,
author = "A. Gheith and R. Rajamony and P. Bohrer and K. Agarwal
and M. Kistler and B. L. White Eagle and C. A.
Hambridge and J. B. Carter and T. Kaplinger",
title = "{IBM} Bluemix Mobile Cloud Services",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "7:1--7:12",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2515422",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kim:2016:BSS,
author = "M. Kim and A. Mohindra and V. Muthusamy and R. Ranchal
and V. Salapura and A. Slominski and R. Khalaf",
title = "Building scalable, secure, multi-tenant cloud services
on {IBM Bluemix}",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "8:1--8:12",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2516942",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arnold:2016:BIC,
author = "B. Arnold and S. A. Baset and P. Dettori and M.
Kalantar and I. I. Mohomed and S. J. Nadgowda and M.
Sabath and S. R. Seelam and M. Steinder and M.
Spreitzer and A. S. Youssef",
title = "Building the {IBM} Containers cloud service",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "9:1--9:12",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2516943",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Oliveira:2016:DSA,
author = "F. Oliveira and T. Eilam and P. Nagpurkar and C. Isci
and M. Kalantar and W. Segmuller and E. Snible",
title = "Delivering software with agility and quality in a
cloud environment",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "10:1--10:11",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2517498",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Suneja:2016:TAC,
author = "S. Suneja and C. Isci and R. Koller and E. de Lara",
title = "Touchless and always-on cloud analytics as a service",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "11:1--11:10",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2518438",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wittern:2016:AHG,
author = "E. Wittern and V. Muthusamy and J. A. Laredo and M.
Vukovic and A. Slominski and S. Rajagopalan and H.
Jamjoom and A. Natarajan",
title = "{API Harmony}: Graph-based search and selection of
{APIs} in the cloud",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "12:1--12:11",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2518818",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Diao:2016:SAI,
author = "Y. Diao and E. Jan and Y. Li and D. Rosu and A.
Sailer",
title = "Service analytics for {IT} service management",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "13:1--13:17",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2520620",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gschwind:2016:WAI,
author = "M. Gschwind",
title = "Workload acceleration with the {IBM POWER}
vector-scalar architecture",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "14:1--14:18",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2527418",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arnold:2016:MME,
author = "M. Arnold and D. Grove and B. Herta and M. Hind and M.
Hirzel and A. Iyengar and L. Mandel and V. A. Saraswat
and A. Shinnar and J. Sim{\'e}on and M. Takeuchi and O.
Tardieu and W. Zhang",
title = "{META}: Middleware for Events, Transactions, and
Analytics",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "15:1--15:10",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2527419",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:FC,
author = "Anonymous",
title = "[Front cover]",
journal = j-IBM-JRD,
volume = "60",
number = "2--3",
pages = "??--??",
month = mar # "\slash " # may,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Apr 5 07:02:20 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rao:2016:PSI,
author = "J. R. Rao",
title = "Preface: Security intelligence",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "0:1--0:5",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rao:2016:SES,
author = "J. R. Rao and S. N. Chari and D. Pendarakis and R.
Sailer and M. Ph. Stoecklin and W. Teiken and A.
Wespi",
title = "Security $ 360^\circ $: Enterprise security for the
cognitive era",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "1:1--1:13",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2556958",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523350/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "1--2",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Park:2016:DCS,
author = "Y. Park and W. Teiken and J. R. Rao and S. N. Chari",
title = "Data classification and sensitivity estimation for
critical asset discovery",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "2:1--2:12",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2557638",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523364/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schales:2016:SAD,
author = "D. L. Schales and J. Jang and T. Wang and X. Hu and D.
Kirat and B. Wuest and M. Ph. Stoecklin",
title = "Scalable analytics to detect {DNS} misuse for
establishing stealthy communication channels",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "3:1--3:14",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2557639",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523348/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vu:2016:FCS,
author = "L. Vu and P. Nguyen and D. Turaga",
title = "Firstfilter: A cost-sensitive approach to malicious
{URL} detection in large-scale enterprise networks",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "4:1--4:10",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2558018",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523343/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Aharoni:2016:IMA,
author = "E. Aharoni and R. Peleg and S. Regev and T. Salman",
title = "Identifying malicious activities from system execution
traces",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "5:1--5:7",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2559358",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523355/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hu:2016:SMC,
author = "X. Hu and J. Jang and T. Wang and Z. Ashraf and M. Ph.
Stoecklin and D. Kirat",
title = "Scalable malware classification with multifaceted
content features and threat intelligence",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "6:1--6:11",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2559378",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523365/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chari:2016:PAU,
author = "S. N. Chari and T. A. Habeck and I. Molloy and Y. Park
and J. R. Rao and W. Teiken",
title = "A platform and analytics for usage and entitlement
analytics",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "7:1--7:12",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2560558",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523361/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coden:2016:UIT,
author = "A. Coden and W. S. Lin and K. Houck and M. Tanenblatt
and J. Boston and J. E. MacNaught and D. Soroker and J.
D. Weisz and S. Pan and J.-H. -H. Lai and J. Lu and S.
Wood and Y. Xia and C.-Y. -Y. Lin",
title = "Uncovering insider threats from the digital footprints
of individuals",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "8:1--8:11",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2568538",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523357/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stoecklin:2016:PSI,
author = "M. Ph. Stoecklin and K. Singh and L. Koved and X. Hu
and S. N. Chari and J. R. Rao and P.-C. Cheng and M.
Christodorescu and R. Sailer and D. L. Schales",
title = "Passive security intelligence to analyze the security
risks of mobile\slash {BYOD} activities",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "9:1--9:13",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2569858",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523356/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berger:2016:CLN,
author = "S. Berger and Y. Chen and X. Hu and D. Pendarakis and
J. R. Rao and R. Sailer and D. L. Schales and M. Ph.
Stoecklin",
title = "Closing the loop: Network and in-host monitoring
tandem for comprehensive cloud security visibility",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "10:1--10:12",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2571580",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523362/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berger:2016:SIC,
author = "S. Berger and S. Garion and Y. Moatti and D. Naor and
D. Pendarakis and A. Shulman-Peleg and J. R. Rao and E.
Valdez and Y. Weinsberg",
title = "Security intelligence for cloud management
infrastructures",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "11:1--11:13",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2572462",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523359/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Barlev:2016:SYU,
author = "S. Barlev and Z. Basil and S. Kohanim and R. Peleg and
S. Regev and A. Shulman-Peleg",
title = "Secure yet usable: Protecting servers and {Linux}
containers",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "12:1--12:10",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2574138",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/linux.bib;
https://www.math.utah.edu/pub/tex/bib/unix.bib",
URL = "http://ieeexplore.ieee.org/document/7523363/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Amrein:2016:SII,
author = "A. Amrein and V. Angeletti and A. Beitler and M.
N{\'e}met and M. Reiser and S. Riccetti and M. Ph.
Stoecklin and A. Wespi",
title = "Security intelligence for industrial control systems",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "13:1--13:12",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2575698",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523351/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gkoulalas-Divanis:2016:ISI,
author = "A. Gkoulalas-Divanis and S. Braghin",
title = "{IPV}: A system for identifying privacy
vulnerabilities in datasets",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "14:1--14:10",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2576818",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7523360/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:Cb,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "60",
number = "4",
pages = "??--??",
month = jul # "\slash " # aug,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Helander:2016:PFS,
author = "M. Helander and A. Topol",
title = "Preface: Food Safety, Security, and Defense",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "0:1--0:3",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Weimer:2016:DFM,
author = "B. C. Weimer and D. B. Storey and C. A. Elkins and R.
C. Baker and P. Markwell and D. D. Chambliss and S. B.
Edlund and J. H. Kaufman",
title = "Defining the food microbiome for authentication,
safety, and process management",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "1:1--1:13",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2582598",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580718/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:TCd,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "1--2",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Edlund:2016:DMC,
author = "S. B. Edlund and K. L. Beck and N. Haiminen and L. P.
Parida and D. B. Storey and B. C. Weimer and J. H.
Kaufman and D. D. Chambliss",
title = "Design of the {MCAW} compute service for food safety
bioinformatics",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "2:1--2:12",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2584798",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580716/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bergeron:2016:RRR,
author = "J. G. Bergeron and E. M. Mann and M. W. Farnham and S.
Kennedy and K. Everstine and O.-O. Prasarnphanich and
K. Smith and W. B. Karesh and D. A. Travis and A.
Kircher",
title = "Rapid-response risk evaluation of {Ebola} spread via
the food system",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "3:1--3:12",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2585778",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580679/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Natarajan:2016:MEM,
author = "R. Natarajan and R. C. Baker and R. M. Ford and M. E.
Helander and J. Marecki and B. K. Ray",
title = "Mixed-effects models and tolerance limits for
mycotoxin measurements in food-stock lots",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "4:1--4:11",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2586238",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580665/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Badr:2016:TLS,
author = "G. Badr and L. J. Klein and M. Freitag and C. M.
Albrecht and F. J. Marianno and S. Lu and X. Shao and
N. Hinds and G. Hoogenboom and H. F. Hamann",
title = "Toward large-scale crop production forecasts for
global food security",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "5:1--5:11",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2591698",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580661/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fleming:2016:TFD,
author = "K. Fleming and A. Kouassi and E. Ondula and P.
Waweru",
title = "Toward farmer decision profiles to improve food
security in {Kenya}",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "6:1--6:10",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2592278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580717/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eck:2016:TDW,
author = "B. J. Eck and H. Saito and S. A. McKenna",
title = "Temperature dynamics and water quality in distribution
systems",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "7:1--7:8",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2594128",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580677/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bergholz:2016:TAB,
author = "P. W. Bergholz and M. Wiedmann",
title = "Toward agent-based models for pre-harvest food
safety",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "8:1--8:13",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2596378",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580678/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Yam:2016:SPT,
author = "K. L. Yam and P. Takhistov",
title = "Sustainable packaging technology to improve food
safety",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "9:1--9:7",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2597018",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580697/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Li:2016:FTF,
author = "H. Li and B. Zhang and L. Zhang and Y. Xue and M. He
and C. Ren",
title = "A food traceability framework for dairy and other
low-margin products",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "10:1--10:8",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2598610",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580662/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vlachos:2016:TIP,
author = "M. Vlachos and V. G. Vassiliadis and R. Heckel and A.
Labbi",
title = "Toward interpretable predictive models in {B2B}
recommender systems",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "11:1--11:12",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2602097",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7580713/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2016:Cc,
author = "Anonymous",
title = "Cover 1",
journal = j-IBM-JRD,
volume = "60",
number = "5--6",
pages = "??--??",
month = sep # "\slash " # nov,
year = "2016",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 4 07:05:32 MDT 2016",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bivens:2017:PCC,
author = "Alan Bivens and Hari Ramasamy",
title = "Preface: Cognitive and Contextual Analytics for {IT}
Services",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "0:1--0:4",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:FCa,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "??--??",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "1--2",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Herger:2017:EES,
author = "L. M. Herger and W. J. Rippon and C. A. Fonseca and W.
Pointer and B. M. Belgodere and W. H. Cornejo and M. J.
Frissora",
title = "End-to-end service data analysis: Efficiencies
achieved across the enterprise",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "1:5--1:16",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2626858",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877285/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ramakrishna:2017:PEE,
author = "V. Ramakrishna and N. Rajput and S. Mukherjea and K.
Dey",
title = "A platform for end-to-end mobile application
infrastructure analytics using system log correlation",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "2:17--2:26",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2626862",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877288/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Deng:2017:ASS,
author = "Y. Deng and K. E. Maghraoui and T. D. Griffin and V.
Agarwal and S. G. Tamilselvam and R. D. Sharnagat and
T. H. Alexander and N. E. G{\'o}mez and C. M. Cramer
and A. Bivens and D. Jadav and Z. M. Valli-Hasham and
K. Wahlmeier",
title = "Advanced search system for {IT} support services",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "3:27--3:40",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2628658",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877289/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Agarwal:2017:APE,
author = "S. Agarwal and V. Aggarwal and A. R. Akula and G. B.
Dasgupta and G. Sridhara",
title = "Automatic problem extraction and analysis from
unstructured text in {IT} tickets",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "4:41--4:52",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2629318",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877279/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ponnalagu:2017:ODR,
author = "K. Ponnalagu",
title = "Ontology-driven root-cause analytics for user-reported
symptoms in managed {IT} systems",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "5:53--5:61",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2629319",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877282/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Meng:2017:ITD,
author = "F. J. Meng and M. N. Wegman and J. M. Xu and X. Zhang
and P. Chen and G. Chafle",
title = "{IT} troubleshooting with drift analysis in the
{DevOps} era",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "6:62--6:73",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2630478",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877287/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dhoolia:2017:CSB,
author = "P. Dhoolia and P. Chugh and P. Costa and N. Gantayat
and M. Gupta and N. Kambhatla and R. Kumar and S. Mani
and P. Mitra and C. Rogerson and M. Saxena",
title = "A cognitive system for business and technical support:
A case study",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "7:74--7:85",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2631398",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877283/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sarkar:2017:EST,
author = "S. Sarkar and B. Tak",
title = "Entity search techniques for expediting entitlement
resolution in technology support services",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "8:86--8:97",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2631399",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877284/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Giurgiu:2017:AIP,
author = "I. Giurgiu and D. Wiesmann and J. Bogojeska and D.
Lanyi and G. Stark and R. B. Wallace and M. M. Pereira
and A. A. Hidalgo",
title = "On the adoption and impact of predictive analytics for
server incident reduction",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "9:98--9:109",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2631400",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877290/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Butler:2017:ESS,
author = "E. Butler and T. D. Griffin and D. Jadav and H. P.
Petersen and A. A. Barabas",
title = "Enterprise storage software lifecycle management
system",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "10:110--10:120",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2016.2636758",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877286/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wang:2017:PMB,
author = "J. Wang and C. Li and S. Han and S. Sarkar and X.
Zhou",
title = "Predictive maintenance based on event-log analysis: A
case study",
journal = j-IBM-JRD,
volume = "61",
number = "1",
pages = "11:121--11:132",
month = "????",
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2648298",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Mar 16 07:01:59 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7877280/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:FCb,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "??--??",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "1--2",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cecchi:2017:PCN,
author = "Guillermo A. Cecchi and James Kozloski",
title = "Preface: Computational neuroscience",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "0:1--0:4",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cecchi:2017:CSL,
author = "G. A. Cecchi and V. Gurev and S. J. Heisig and R.
Norel and I. Rish and S. R. Schrecke",
title = "Computing the structure of language for
neuropsychiatric evaluation",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "1:1--1:10",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921633/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webster:2017:PCS,
author = "E. Webster and N. Sukaviriya and H. -Y. Chang and J.
Kozloski",
title = "Predicting cognitive states from wearable recordings
of autonomic function",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "2:1--2:11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921701/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Rish:2017:HBD,
author = "I. Rish and G. A. Cecchi",
title = "Holographic brain: Distributed versus local activation
patterns in {fMRI}",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "3:1--3:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921647/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Polosecki:2017:CPA,
author = "P. Polosecki and E. Castro and A. Wood and J. H.
Warner and I. Rish and G. A. Cecchi",
title = "Computational psychiatry: Advancing predictive
modeling of neurodegeneration with neuroimaging of
{Huntington}'s disease",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "4:1--4:10",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921645/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Lungu:2017:PVM,
author = "I. -A. Lungu and A. Riehle and M. P. Nawrot and M.
Schmuker",
title = "Predicting voluntary movements from motor cortical
activity with neuromorphic hardware",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "5:1--5:12",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921644/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dura-Bernal:2017:EAO,
author = "S. Dura-Bernal and S. A. Neymotin and C. C. Kerr and
S. Sivagnanam and A. Majumdar and J. T. Francis and W.
W. Lytton",
title = "Evolutionary algorithm optimization of biological
learning parameters in a biomimetic neuroprosthesis",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "6:1--6:14",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7922468/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mashford:2017:NNB,
author = "B. S. Mashford and A. Jimeno Yepes and I. Kiral-Kornek
and J. Tang and S. Harrer",
title = "Neural-network-based analysis of {EEG} data using the
neuromorphic {TrueNorth} chip for brain-machine
interfaces",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "7:1--7:6",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921702/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nieters:2017:NCM,
author = "P. Nieters and J. Leugering and G. Pipa",
title = "Neuromorphic computation in multi-delay coupled
models",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "8:7--8:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921635/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Llobet:2017:MNS,
author = "J. -Y. Puigb{\`o} Llobet and M. A. Gonzalez-Ballester
and P. F. M. J. Verschure",
title = "Modeling the neural substrates of learning through
conditioning: A two-phased model",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "9:1--9:11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7922648/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Guo:2017:IAC,
author = "J. Guo and C. Shi and G. Azzopardi and N. Petkov",
title = "Inhibition-augmented {COSFIRE} model of
shape-selective neurons",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "10:1--10:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921700/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Trong:2017:DSM,
author = "T. M. Hoang Trong and S. E. Motley and J. Wagner and
R. R. Kerr and J. Kozloski",
title = "Dendritic spines modify action potential
back-propagation in a multicompartment neuronal model",
journal = j-IBM-JRD,
volume = "61",
number = "2--3",
pages = "11:1--11:13",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:15 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/7921703/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:FCc,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "??--??",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2017:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "1--2",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Campbell:2017:PDL,
author = "Murray Campbell and Tim Klinger",
title = "Preface: Deep learning",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "4:1--4:5",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Saon:2017:RAC,
author = "G. Saon and M. Picheny",
title = "Recent advances in conversational speech recognition
using convolutional and recurrent neural networks",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "1:1--1:10",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030294/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Audhkhasi:2017:RPD,
author = "K. Audhkhasi and A. Rosenberg and G. Saon and A. Sethy
and B. Ramabhadran and S. Chen and M. Picheny",
title = "Recent progress in deep end-to-end models for spoken
language processing",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "2:1--2:10",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030300/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Adi:2017:ASE,
author = "Y. Adi and E. Kermany and Y. Belinkov and O. Lavi and
Y. Goldberg",
title = "Analysis of sentence embedding models using prediction
tasks in natural language processing",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "3:1--3:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030297/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bhattacharjee:2017:DLD,
author = "B. Bhattacharjee and M. L. Hill and H. Wu and P. S.
Chandakkar and J. R. Smith and M. N. Wegman",
title = "Distributed learning of deep feature embeddings for
visual recognition tasks",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "4:1--4:8",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030315/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Codella:2017:DLE,
author = "N. C. F. Codella and Q. -B. Nguyen and S. Pankanti and
D. A. Gutman and B. Helba and A. C. Halpern and J. R.
Smith",
title = "Deep learning ensembles for melanoma recognition in
dermoscopy images",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "5:1--5:15",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030303/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bozorgtabar:2017:SLS,
author = "B. Bozorgtabar and S. Sedai and P. K. Roy and R.
Garnavi",
title = "Skin lesion segmentation using deep convolution
networks guided by local unsupervised learning",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "6:1--6:8",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030296/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nair:2017:WAS,
author = "R. Nair and S. Gupta",
title = "Wildfire: Approximate synchronization of parameters in
distributed deep learning",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "7:1--7:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030302/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gschwind:2017:OED,
author = "M. Gschwind and T. Kaldewey and D. K. Tam",
title = "Optimizing the efficiency of deep learning through
accelerator virtualization",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "12:1--12:11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030299/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Osogami:2017:LVH,
author = "T. Osogami and S. Dasgupta",
title = "Learning the values of the hyperparameters of a
dynamic {Boltzmann} machine",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "8:1--8:8",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030295/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Diaz:2017:EAH,
author = "G. I. Diaz and A. Fokoue-Nkoutche and G. Nannicini and
H. Samulowitz",
title = "An effective algorithm for hyperparameter optimization
of neural networks",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "9:1--9:11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030298/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bhattacharjee:2017:IDL,
author = "B. Bhattacharjee and S. Boag and C. Doshi and P. Dube
and B. Herta and V. Ishakian and K. R. Jayaram and R.
Khalaf and A. Krishna and Y. B. Li and V. Muthusamy and
R. Puri and Y. Ren and F. Rosenberg and S. R. Seelam
and Y. Wang and J. M. Zhang and L. Zhang",
title = "{IBM Deep Learning Service}",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "10:1--10:11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030274/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Narayanan:2017:TCA,
author = "P. Narayanan and A. Fumarola and L. L. Sanches and K.
Hosokawa and S. C. Lewis and R. M. Shelby and G. W.
Burr",
title = "Toward on-chip acceleration of the backpropagation
algorithm using nonvolatile memory",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "1--11",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030206/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Ziegler:2017:MLT,
author = "M. M. Ziegler and R. Bertran and A. Buyuktosunoglu and
P. Bose",
title = "Machine learning techniques for taming the complexity
of modern hardware design",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "13:1--13:14",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8032559/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bakis:2017:PNL,
author = "R. Bakis and D. P. Connors and P. Dube and P.
Kapanipathi and A. Kumar and D. Malioutov and C.
Venkatramani",
title = "Performance of natural language classifiers in a
question-answering system",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "14:1--14:10",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030301/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baughman:2017:ULM,
author = "A. K. Baughman and S. Hammer and D. Provan",
title = "Using language models for improving speech recognition
for {U.S. Open Tennis Championships}",
journal = j-IBM-JRD,
volume = "61",
number = "4--5",
pages = "15:1--15:9",
month = "????",
year = "2017",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sat Sep 16 09:55:16 MDT 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8030314/",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tao:2017:EPD,
author = "Y. Tao and D. Bhattacharjya and A. R. Heching and A.
Vempaty and M. Singh and F. Lam and J. Houdek and M.
Abubakar and A. Abdulwahab and T. Braimoh and N.
Ihebuzor and A. Mojsilovi and K. R. Varshney",
title = "Effectiveness of peer detailing in a diarrhea program
in {Nigeria}",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "1:1--1:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2713278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Africa; Diseases; Logistics; Medical services; Medical
treatment; Pediatrics; Public healthcare; Regression
analysis; Salts; Testing; Zinc",
}
@Article{Chen:2017:EIA,
author = "L. L. Chen and J. Xu and Q. Zhang and Q. H. Wang and
Y. Q. Xue and C. R. Ren",
title = "Evaluating impact of air pollution on different
diseases in {Shenzhen, China}",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "2:1--2:9",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2713258",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Air pollution; Atmospheric modeling; Diseases; Human
factors; Public healthcare; Social factors",
}
@Article{Fang:2017:PPW,
author = "F. Fang and T. H. Nguyen and A. Sinha and S. Gholami
and A. Plumptre and L. Joppa and M. Tambe and M.
Driciru and F. Wanyama and A. Rwetsiba and R. Critchlow
and C. M. Beale",
title = "Predicting poaching for wildlife protection",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "3:1--3:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2713584",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Algorithm design and analysis; Animals; Computational
modeling; Data analysis; Data collection; Data models;
Game theory; Hazards; Modeling; Predictive models",
}
@Article{Yadav:2017:USN,
author = "A. Yadav and H. Chan and A. X. Jiang and H. Xu and E.
Rice and R. Petering and M. Tambe",
title = "Using social networks to raise {HIV} awareness among
homeless youth",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "4:1--4:10",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2716678",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Computational modeling; Human
factors; Human immunodeficiency virus; information
services; Knowledge engineering; Social factors; Social
network services",
}
@Article{Goudey:2017:FOH,
author = "B. Goudey and R. I. Hickson and C. K. H.
Hettiarachchige and M. Pore and C. Reeves and O. J.
Smith and A. Swan",
title = "A framework for optimal health worker allocation in
under-resourced regions",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "5:1--5:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2716679",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Data collection; Data models; Decision support
systems; Economics; Employment; Medical services;
Modeling; Performance evaluation; Resource management;
Statistical analysis",
}
@Article{Lamba:2017:UEP,
author = "H. Lamba and M. E. Helander and M. Singh and N. Lethif
and A. Bhamidipaty and S. A. Baset and A. Mojsilovi and
K. R. Varshney",
title = "Understanding the ecospace of philanthropic projects",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "6:1--6:10",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2717098",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Databases; Economics; Globalization; Knowledge
transfer; Medical services; Organizations; Portfolios;
Project management",
}
@Article{Pham:2017:RTU,
author = "K. T. Pham and P. Sattigeri and A. Dhurandhar and A.
C. Jacob and M. Vukovic and P. Chataigner and J. Freire
and A. Mojsilovi and K. R. Varshney",
title = "Real-time understanding of humanitarian crises via
targeted information retrieval",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "7:1--7:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2722799",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Algorithm design and analysis; Automation;
Classification algorithms; Content management;
Economics; Feedback; Humanitarian activities;
Information retrieval; Organizations; Project
management",
}
@Article{Sherchan:2017:HTI,
author = "W. Sherchan and S. Pervin and C. J. Butler and J. C.
Lai and L. Ghahremanlou and B. Han",
title = "Harnessing {Twitter} and {Instagram} for disaster
management",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "8:1--8:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2729238",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Australia; Data collection; Disasters; Emergency
services; Government; Information technology; Media
streaming; Resource management; Social network
services",
}
@Article{Patterson:2017:DRD,
author = "E. Patterson and R. McBurney and H. Schmidt and I.
Baldini and A. Mojsilovi and K. R. Varshney",
title = "Dataflow representation of data analyses: Toward a
platform for collaborative data science",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "9:1--9:13",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2736278",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Biological system modeling; Collaboration; Data
science; Graphical models; Medical services; Medical
treatment; Multiple sclerosis; Patient rehabilitation",
}
@Article{Bolten:2017:PCD,
author = "N. Bolten and S. Mukherjee and V. Sipeeva and A.
Tanweer and A. Caspi",
title = "A pedestrian-centered data approach for equitable
access to urban infrastructure environments",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "10:1--10:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2736279",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Assistive technology; Data models; Information
technology; Public policy; Routing; Transient analysis;
Urban areas",
}
@Article{Kuhlman:2017:HFI,
author = "C. Kuhlman and K. N. Ramamurthy and P. Sattigeri and
A. C. Lozano and L. Cao and C. Reddy and A. Mojsilovi
and K. R. Varshney",
title = "How to foster innovation: A data-driven approach to
measuring economic competitiveness",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "11:1--11:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2741820",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Economics; Globalization; Government policies; Machine
learning; Measurement; Modeling; Predictive models;
Technological innovation",
}
@Article{Zeni:2017:EIN,
author = "M. Zeni and K. Weldemariam",
title = "Extracting information from newspaper archives in
{Africa}",
journal = j-IBM-JRD,
volume = "61",
number = "6",
pages = "12:1--12:12",
month = nov,
year = "2017",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2017.2742706",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Dec 7 06:17:20 2017",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Africa; Data mining; Electronic publishing;
Information retrieval; Public policy; Publishing; Text
mining",
}
@Article{Anonymous:2018:FCa,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "??--??",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chen:2018:PUG,
author = "Ching-Hua Chen and Kenney Ng",
title = "Preface: User-generated health data and applications",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "1--3",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bocu:2018:HEB,
author = "R. Bocu and C. Costache",
title = "A homomorphic encryption-based system for securely
managing personal health metrics data",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "1:1--1:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269765/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kakkanatt:2018:CIU,
author = "C. Kakkanatt and M. Benigno and V. M. Jackson and P.
L. Huang and K. Ng",
title = "Curating and integrating user-generated health data
from multiple sources to support healthcare analytics",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "2:1--2:7",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269772/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Codella:2018:DQC,
author = "J. Codella and C. Partovian and H. -Y. Chang and C.
-H. Chen",
title = "Data quality challenges for person-generated health
and wellness data",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "3:1--3:8",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269766/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hu:2018:IHB,
author = "X. Hu and P. -Y. S. Hsueh and C. -H. Chen and K. M.
Diaz and F. E. Parsons and I. Ensari and M. Qian and Y.
-K. K. Cheung",
title = "An interpretable health behavioral intervention policy
for mobile device users",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "4:1--4:6",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269770/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pissadaki:2018:DCM,
author = "E. K. Pissadaki and A. G. S. Abrami and S. J. Heisig
and E. Bilal and M. Cavallo and P. W. Wacnik and K. Erb
and D. R. Karlin and P. R. Bergethon and S. P. Amato
and H. Zhang and V. L. Ramos and F. Hameed and J. J.
Rice",
title = "Decomposition of complex movements into primitives for
{Parkinson}'s disease assessment",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "5:1--5:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269771/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Takagi:2018:ESB,
author = "H. Takagi and M. Ohno and M. Kobayashi and T. Nakada",
title = "Evaluating speech-based question--answer interactions
for elder-care services",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "6:1--6:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269769/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Vioules:2018:DSR,
author = "M. Johnson Vioul{\`e}s and B. Moulahi and J. Az{\'e}
and S. Bringay",
title = "Detection of suicide-related posts in {Twitter} data
streams",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "7:1--7:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269767/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kloeckner:2018:BCP,
author = "K. Kloeckner and C. M. Adam and N. Anerousis and N.
Ayachitula and M. F. Bulut and G. Dasgupta and Y. Deng
and Y. Diao and N. Fuller and S. Gopisetty and M.
Hernandez and J. Hwang and P. Iannucci and A. K. Kalia
and G. Lanfranchi and D. Lanyi and H. Ludwig and A.
Mahamuni and R. Mahindru and F. J. Meng and H. R.
Motahari Nezhad and K. Murthy and T. Nakamura and A.
Paradkar and D. Perpetua and B. Pfitzmann and D. Rosu
and L. Shwartz and Z. Su and M. Surendra and S. Tao and
H. V{\"o}lzer and M. Vukovic and D. Wiesmann and S.
Wozniak and G. Wright and J. Xiao and S. Zeng",
title = "Building a cognitive platform for the managed {IT}
services lifecycle",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "8:1--8:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269344/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Gschwind:2018:RSE,
author = "M. Gschwind and U. Weigand",
title = "Reengineering a server ecosystem for enhanced
portability and performance",
journal = j-IBM-JRD,
volume = "62",
number = "1",
pages = "9:1--9:13",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 1 06:34:25 MST 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "http://ieeexplore.ieee.org/document/8269768/",
acknowledgement = ack-nhfb,
journal-URL = "ahttp://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:FCb,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "??--??",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mauri:2018:MGM,
author = "R. A. Mauri",
title = "Message from the {General Manager, IBM Z}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8353753/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eickhoff:2018:PIZ,
author = "Felix Eickhoff",
title = "Preface: {IBM z14} Design and Technology",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "1--4",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8353758/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eickhoff:2018:LSA,
author = "F. L. Eickhoff and M. L. McGrath and C. Mayer and A.
Bieswanger and P. A. Wojciak",
title = "Large-scale application of {IBM} Design Thinking and
Agile development for {IBM z14}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "1:1--1:9",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8270603/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jordan:2018:EPE,
author = "M. Jordan and N. Sardino and M. McGrath and C. Zoellin
and T. E. Morris and C. Carranza Lewis and G. Vance and
B. Naylor and J. Pickel and M. S. Almeida and D.
Wierbowski and C. Meyer and R. Buendgen and M. Zagorski
and H. Schoone and K. Voss",
title = "Enabling pervasive encryption through {IBM Z} stack
innovations",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "2:1--2:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8270590/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roscher:2018:ISI,
author = "S. Roscher and V. B{\"o}nisch and J. Lee and D.
Zeisberg and J. Schweflinghaus",
title = "Integrating solutions on {IBM Z} with {Secure Service
Container}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "3:1--3:6",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8281496/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mencias:2018:OBS,
author = "A. Nu{\~n}ez Mencias and D. Dillenberger and P.
Novotny and F. Toth and T. E. Morris and V. Paprotski
and J. Dayka and T. Visegrady and B. O'Farrell and J.
Lang and E. Carbarnes",
title = "An optimized blockchain solution for the {IBM z14}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "4:1--4:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8276264/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bradbury:2018:IZC,
author = "J. D. Bradbury and A. Chatterjee and A. Saporito and
N. P. Sardino and J. S. Siu and A. T. Sofia and E.
Tzortzatos and K. W. Wei",
title = "{IBM z14} and the Cognitive Era",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "5:1--5:9",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8268108/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mayer:2018:PSI,
author = "C. Mayer and A. Brand and A. Bieswanger and B. D.
Valentine and E. A. Weinmann and H. Wolf and T. Reiser
and S. Korba and W. Niklaus",
title = "Platform simplification for {IBM z14}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "6:1--6:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8268109/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Walters:2018:PII,
author = "C. R. Walters and D. S. Hutton and E. W. Chencinski
and C. Axnix and R. Winkelmann and M. Fee and A.
Saporito and C. Jacobi",
title = "Performance innovations in the {IBM z14} platform",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "7:1--7:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8269266/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jacobi:2018:DIZ,
author = "C. Jacobi and A. Saporito and M. Recktenwald and A.
Tsai and U. Mayer and M. Helms and A. B. Collura and P.
-K. Mak and R. J. Sonnelitter and M. A. Blake and T. C.
Bronson and A. J. O'Neill and V. K. Papazova",
title = "Design of the {IBM z14} microprocessor",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "8:1--8:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8270679/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berry:2018:IZD,
author = "C. Berry and J. Warnock and J. Badar and D. G. Bair
and E. Behnen and B. Bell and A. Buyuktosunoglu and C.
Cavitt and P. Chuang and O. Geva and D. Hamid and J.
Isakson and P. M. Lobo and F. Malgioglio and G. Mayer
and J. L. Neves and T. Strach and J. Surprise and C.
Vezyrtzis and T. Webel and D. Wolpert",
title = "{IBM z14} design methodology enhancements in the 14-nm
technology node",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "9:1--9:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8276267/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wolpert:2018:IZE,
author = "D. Wolpert and E. Behnen and L. Sigal and Y. Chan and
G. E. T{\'e}llez and D. Bradley and R. Serton and R.
Veerabhadraiah and W. Ansley and A. Bianchi and N.
Dhanwada and S. Lee and M. Scheuermann and G.
Wiedemeier and J. Davis and T. Werner and L. Darden and
K. Barkley and M. Gray and M. Guzowski and M. DeHond
and T. Schell and S. Tsapepas and D. Phan and K.
Acharya and J. A. Zitz and H. F. Shi and C. Berry and
J. Warnock and M. H. Wood and R. M. Averill III",
title = "{IBM z14}: Enabling physical design in 14-nm
technology for high-performance, high-reliability
microprocessors",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "10:1--10:14",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8276273/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stiffler:2018:PTI,
author = "S. R. Stiffler and R. Ramachandran and W. K. Henson
and N. D. Zamdmer and K. McStay and G. {La Rosa} and K.
M. Boyd and S. Lee and C. Ortolland and P. C. Parries",
title = "Process technology for {IBM} 14-nm processor designs
featuring silicon-on-insulator {FinFETs}",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "11:1--11:7",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8276292/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Zoellin:2018:NDC,
author = "C. G. Zoellin and O. Draese and J. D. Bradbury and C.
Jacobi and A. Puranik and P. Sutton and R. Tokumaru",
title = "New database compression assists in the {IBM z14}
processor",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "12:1--12:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8281056/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Craddock:2018:ZLL,
author = "D. Craddock and A. Hoshikawa and J. Josten and D. F.
Riedy and P. G. Sutton and H. M. Yudenfriend",
title = "{zHyperLink}: Low-latency {I/O} for {Db2} on {IBM Z}
and {DS8880} storage",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "13:1--13:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8280518/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Becht:2018:IZA,
author = "M. Becht and S. G. Aden and T. Bubb and C. Colonna and
R. Higgs and L. Hopkins and A. Li and M. Saleheen and
J. F. Silverio and R. Wong and M. Zee",
title = "{IBM z14}: Advancing the {I/O} storage and networking
channel adapter",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "14:1--14:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8281488/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Surman:2018:IZP,
author = "D. H. Surman and G. L. Kurdt and R. K. Errickson and
P. D. Driever and A. M. Clayton and S. N. Goss and P.
K. Szwed",
title = "{IBM z14 Parallel Sysplex} and coupling technology",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "15:1--15:8",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8281498/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kostenko:2018:IZI,
author = "W. P. Kostenko and D. W. Demetriou and J. G. Torok",
title = "{IBM z14}: Improved datacenter characteristics, energy
efficiency, and packaging innovation",
journal = j-IBM-JRD,
volume = "62",
number = "2--3",
pages = "16:1--16:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu May 10 14:55:17 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8283825/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:FCc,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "??--??",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Picciano:2018:MSV,
author = "Bob Picciano",
title = "Message from the {Senior Vice President, IBM Cognitive
Systems}",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8464027/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pattnaik:2018:PIP,
author = "Pratap Pattnaik",
title = "Preface: {IBM POWER9} Technology",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "1--2",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8463988/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Arimilli:2018:IPP,
author = "L. B. Arimilli and B. Blaner and B. C. Drerup and C.
F. Marino and D. E. Williams and E. N. Lais and F. A.
Campisano and G. L. Guthrie and M. S. Floyd and R. B.
Leavens and S. M. Willenborg and R. Kalla and B.
Abali",
title = "{IBM POWER9} processor and system features for
computing in the cognitive era",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "1:1--1:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8458465/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Le:2018:IPP,
author = "H. Q. Le and J. A. {Van Norstrand} and B. W. Thompto
and J. E. Moreira and D. Q. Nguyen and D. Hrusecky and
M. J. Genden and M. Kroener",
title = "{IBM POWER9} processor core",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "2:1--2:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8409955/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Starke:2018:IPM,
author = "W. J. Starke and J. S. Dodson and J. Stuecheli and E.
Retter and B. W. Michael and S. J. Powell and J. A.
Marcella",
title = "{IBM POWER9} memory architectures for optimized
systems",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "3:1--3:13",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8383687/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Fluhr:2018:IPC,
author = "E. J. Fluhr and R. M. Rao and H. Smith and A.
Buyuktosunoglu and R. Bertran",
title = "{IBM POWER9} circuit design and energy optimization
for $ 14$-nm technology",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "4:1--4:11",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8383685/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Auernhammer:2018:XEI,
author = "F. Auernhammer and R. L. Arndt",
title = "{XIVE}: External interrupt virtualization for the
cloud infrastructure",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "5:1--5:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
URL = "https://ieeexplore.ieee.org/document/8383690/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Jann:2018:IPS,
author = "J. Jann and P. Mackerras and J. Ludden and M. Gschwind
and W. Ouren and S. Jacobs and B. F. Veale and D.
Edelsohn",
title = "{IBM POWER9} system software",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "6:1--6:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8392671/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nett:2018:IPS,
author = "N. S. Nett and R. X. Arroyo and T. Nguyen and B. W.
Mashak and R. M. Zgabay and H. Nguyen and C. W. Mann
and E. J. Hauptli and S. P. Mroz and W. J. Anderl",
title = "{IBM POWER9} systems designed for commercial,
cognitive, and cloud",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "7:1--7:13",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8458311/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stuecheli:2018:IPO,
author = "J. Stuecheli and W. J. Starke and J. D. Irish and L.
B. Arimilli and D. Dreps and B. Blaner and C. Wollbrink
and B. Allison",
title = "{IBM POWER9} opens up a new era of acceleration
enablement: {OpenCAPI}",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "8:1--8:8",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8413085/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kumar:2018:IPC,
author = "M. Kumar and W. P. Horn and J. Kepner and J. E.
Moreira and P. Pattnaik",
title = "{IBM POWER9} and cognitive computing",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "10:1--10:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8392693/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Schubert:2018:AVC,
author = "K. -D. Schubert and S. S. Abrar and D. Averill and E.
Bauman and A. C. Brown and R. Cash and D. Chatterjee
and J. Gullickson and M. Nelson and K. A. Pasnik and K.
Sugavanam",
title = "Addressing verification challenges of heterogeneous
systems based on {IBM POWER9}",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "11:1--11:12",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8387435/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Chun:2018:IPP,
author = "S. Chun and W. D. Becker and J. Casey and S. Ostrander
and D. Dreps and J. A. Hejase and R. M. Nett and B.
Beaman and J. R. Eagle",
title = "{IBM POWER9} package technology and design",
journal = j-IBM-JRD,
volume = "62",
number = "4--5",
pages = "12:1--12:10",
month = "????",
year = "2018",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Sep 13 11:17:13 MDT 2018",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
URL = "https://ieeexplore.ieee.org/document/8392682/",
acknowledgement = ack-nhfb,
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:FCd,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "C1--C1",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2895986",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 11 10:51:01 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2018:TCd,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "1--2",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2895984",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:52:41 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cornell:2018:PCT,
author = "W. Cornell",
title = "Preface: Computational Technologies for Drug
Discovery",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "1--2",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893982",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:52:41 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cooper:2018:CNC,
author = "K. Cooper",
title = "The challenge of new chemical entities attrition",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "1:1--1:9",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2883313",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:52:41 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Biology; Companies; Compounds; Diseases; Drugs;
Testing",
}
@Article{Pyzer-Knapp:2018:BOA,
author = "E. O. Pyzer-Knapp",
title = "{Bayesian} optimization for accelerated drug
discovery",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "2:1--2:7",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2881731",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:52:41 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bayes methods; Compounds; Diseases; Drugs;
Optimization; Predictive models; Task analysis",
}
@Article{Koes:2018:PBC,
author = "D. R. Koes",
title = "The {Pharmit} backend: A computer systems approach to
enabling interactive online drug discovery",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "3:1--3:6",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2883977",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:52:41 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Compounds; Data structures; Databases; Libraries;
Metadata; Parallel processing; Shape",
}
@Article{Acun:2018:SMD,
author = "B. Acun and D. J. Hardy and L. V. Kale and K. Li and
J. C. Phillips and J. E. Stone",
title = "Scalable molecular dynamics with {NAMD} on the
{Summit} system",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "4:1--4:9",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2888986",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Biological system modeling; Computational modeling;
Computer architecture; Force; Graphics processing
units; Layout",
}
@Article{Zipoli:2018:SMD,
author = "F. Zipoli and M. Hijazi and R. Petraglia and V. Weber
and T. Laino",
title = "Semiempirical molecular dynamics ({SEMD}) simulations:
Parameterization and validation for biological systems
precursors",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "5:1--5:9",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2887388",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Biological system modeling; Computational efficiency;
Computational modeling; Manganese; Mathematical model;
Orbits; Reliability",
}
@Article{Cao:2018:PQC,
author = "Y. Cao and J. Romero and A. Aspuru-Guzik",
title = "Potential of quantum computing for drug discovery",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "6:1--6:20",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2888987",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Computational modeling; Computers; Drugs; Machine
learning; Proteins; Quantum computing",
}
@Article{Shim:2018:SAD,
author = "J. Shim and H. Luo and P. Zhang and Y. Li",
title = "Systematic analysis of drug combinations that mitigate
adverse drug reactions",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "7:1--7:9",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2875837",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Antidepressants; Biological information theory;
Chemicals; Diseases; Prediction algorithms;
Systematics",
}
@Article{Martin:2018:HNL,
author = "R. L. Martin and D. Martinez Iraola and E. Louie and
D. Pierce and B. A. Tagtow and J. J. Labrie and P. G.
Abrahamson",
title = "Hybrid natural language processing for
high-performance patent and literature mining in {IBM
Watson} for Drug Discovery",
journal = j-IBM-JRD,
volume = "62",
number = "6",
pages = "8:1--8:12",
month = nov # "\slash " # dec,
year = "2018",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2888975",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Chemicals; Compounds; Data mining; Dictionaries;
Drugs; Ontologies; Runtime",
}
@Article{Anonymous:2019:FCa,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "C1--C1",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2905502",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "1--2",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2905500",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:PAC,
author = "Anonymous",
title = "Preface: Advances in Computational Creativity
Technology",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "1--2",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2906830",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Wiltgen:2019:CTE,
author = "B. J. Wiltgen and A. K. Goel",
title = "A computational theory of evaluation in creative
design",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "1:1--1:11",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893901",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Biological system modeling;
Computational modeling; Creativity; Problem-solving;
Rail transportation",
}
@Article{Varshney:2019:MLT,
author = "L. R. Varshney",
title = "Mathematical limit theorems for computational
creativity",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "2:1--2:12",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893907",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bayes methods; Cognition; Computational modeling;
Creativity; Information geometry; Information theory;
Social groups",
}
@Article{Agrawal:2019:WDC,
author = "S. Agrawal and A. Sankaran and A. Laha and S. A.
Chemmengath and D. Shrivastava and K.
Sankaranarayanan",
title = "What is deemed computationally creative?",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "3:1--3:12",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900640",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Art; Artificial intelligence; Coherence; Creativity;
Motion pictures; Task analysis; Writing",
}
@Article{Khabiri:2019:CCP,
author = "E. Khabiri and Y. Li and P. Mazzoleni and D. Vadgama",
title = "Cognitive color palette creation using client message
and color psychology",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "4:1--4:10",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893904",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Color; Companies; Computer architecture; Image color
analysis; Packaging; Psychology; Visualization",
}
@Article{Karimi:2019:CMV,
author = "P. Karimi and M. L. Maher and K. Grace and N. Davis",
title = "A computational model for visual conceptual blends",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "5:1--5:10",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2018.2881736",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Cognition; Computational
modeling; Creativity; Task analysis; Tools;
Visualization",
}
@Article{Ray:2019:CTG,
author = "A. Ray and P. Agarwal and C. K. Maurya and G. B.
Dasgupta",
title = "Creative tagline generation framework for product
advertisement",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "6:1--6:10",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893900",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Advertising; Cotton; Creativity; Data mining;
Measurement; Task analysis; Tools",
}
@Article{Varshney:2019:BDA,
author = "L. R. Varshney and F. Pinel and K. R. Varshney and D.
Bhattacharjya and A. Sch{\"o}rgendorfer and Y.-M.
Chee",
title = "A big data approach to computational creativity: The
curious case of {Chef Watson}",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "7:1--7:18",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2893905",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Cats; Computational modeling; Computers; Correlation;
Creativity; Prediction algorithms; Systems
architecture",
}
@Article{Gervas:2019:LPN,
author = "P. Gerv{\'a}s and E. Concepci{\'o}n and C. Le{\'o}n
and G. M{\'e}ndez and P. Delatorre",
title = "The long path to narrative generation",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "8:1--8:10",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2896157",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Computational modeling; Creativity; Focusing;
Generators; Planning; Task analysis; Tools",
}
@Article{Martins:2019:CCI,
author = "P. Martins and H. G. Oliveira and J. C.
Gon{\c{c}}alves and A. Cruz and F. A. Cardoso and M.
{\v{Z}}nidar{\v{s}}i{\v{c}} and N. Lavra{\v{c}} and S.
Linkola and H. Toivonen and R. Herv{\'a}s and G.
M{\'e}ndez and P. Gerv{\'a}s",
title = "Computational creativity infrastructure for online
software composition: A conceptual blending use case",
journal = j-IBM-JRD,
volume = "63",
number = "1",
pages = "9:1--9:17",
month = jan # "\slash " # feb,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2898417",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Oct 1 09:44:15 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Computer architecture; Computer viruses; Creativity;
Laboratories; Task analysis; Visualization",
}
@Article{Anonymous:2019:FCb,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "C1--C1",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2912086",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "1--2",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2912084",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:PBT,
author = "Anonymous",
title = "Preface: Blockchain: From Technology to Solutions",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "1--2",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2912087",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Blockchain; Computer architecture; Cryptography;
Fabrics; History; Smart contracts; Supply chains",
}
@Article{Viswanathan:2019:BSR,
author = "R. Viswanathan and D. Dasgupta and S. R.
Govindaswamy",
title = "{Blockchain Solution Reference Architecture (BSRA)}",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "1:1--1:12",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2913629",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Architecture; Blockchain; Distributed databases;
Distributed ledger; Security; Stakeholders",
}
@Article{Manevich:2019:EHF,
author = "Y. Manevich and A. Barger and Y. Tock",
title = "Endorsement in Hyperledger Fabric via service
discovery",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "2:1--2:9",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900647",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bitcoin; Blockchain; Fabrics; Peer-to-peer computing;
Smart contracts",
}
@Article{Benhamouda:2019:SPD,
author = "F. Benhamouda and S. Halevi and T. Halevi",
title = "Supporting private data on {Hyperledger Fabric} with
secure multiparty computation",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "3:1--3:8",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2913621",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Blockchain; Computer architecture; Cryptography;
Fabrics; Peer-to-peer computing; Smart contracts",
}
@Article{Balagurusamy:2019:CA,
author = "V. S. K. Balagurusamy and C. Cabral and S.
Coomaraswamy and E. Delamarche and D. N. Dillenberger
and G. Dittmann and D. Friedman and O. G{\"o}k{\c{c}}e
and N. Hinds and J. Jelitto and A. Kind and A. D. Kumar
and F. Libsch and J. W. Ligman and S. Munetoh and C.
Narayanaswami and A. Narendra and A. Paidimarri and M.
A. P. Delgado and J. Rayfield and C. Subramanian and R.
Vaculin",
title = "Crypto anchors",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "4:1--4:12",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900651",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Authentication; Blockchain; Cryptography; Databases;
Supply chains",
}
@Article{Dillenberger:2019:BAA,
author = "D. N. Dillenberger and P. Novotny and Q. Zhang and P.
Jayachandran and H. Gupta and S. Hans and D. Verma and
S. Chakraborty and J. J. Thomas and M. M. Walli and R.
Vaculin and K. Sarpatwar",
title = "Blockchain analytics and artificial intelligence",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "5:1--5:14",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900638",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analytical models; Artificial intelligence;
Blockchain; Data models; Databases; Fabrics; History",
}
@Article{Tateishi:2019:ASC,
author = "T. Tateishi and S. Yoshihama and N. Sato and S.
Saito",
title = "Automatic smart contract generation using controlled
natural language and template",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "6:1--6:12",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900643",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Law; Marine vehicles; Natural languages; Smart
contracts",
}
@Article{Narayanaswami:2019:BAS,
author = "C. Narayanaswami and R. Nooyi and S. R. Govindaswamy
and R. Viswanathan",
title = "Blockchain anchored supply chain automation",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "7:1--7:11",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2900655",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Automation; Blockchain; Complexity theory;
Optimization; Real-time systems; Supply chains",
}
@Article{Curbera:2019:BEH,
author = "F. Curbera and D. M. Dias and V. Simonyan and W. A.
Yoon and A. Casella",
title = "Blockchain: An enabler for healthcare and life
sciences transformation",
journal = j-IBM-JRD,
volume = "63",
number = "2--3",
pages = "8:1--8:9",
month = mar # "\slash " # may,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2913622",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Jul 25 15:06:42 2019",
bibsource = "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Blockchain; Clinical trials; Smart contracts",
}
@Article{Anonymous:2019:FCc,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "C1--C1",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945749",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:TCc,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "1--2",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945747",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:PAE,
author = "Anonymous",
title = "Preface: {AI} Ethics",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "1--1",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2944775",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Balakrishnan:2019:UMA,
author = "A. Balakrishnan and D. Bouneffouf and N. Mattei and F.
Rossi",
title = "Using multi-armed bandits to learn ethical priorities
for online {AI} systems",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "1:1--1:13",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945271",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Decision making; Education; Ethics; Linear
programming; Motion pictures; Reinforcement learning",
}
@Article{Noothigattu:2019:TAA,
author = "R. Noothigattu and D. Bouneffouf and N. Mattei and R.
Chandra and P. Madan and K. R. Varshney and M. Campbell
and M. Singh and F. Rossi",
title = "Teaching {AI} agents ethical values using
reinforcement learning and policy orchestration",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "2:1--2:9",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2940428",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Decision making; Ethics; Neural networks;
Reinforcement learning; Robots; Trajectory",
}
@Article{Sattigeri:2019:FGG,
author = "P. Sattigeri and S. C. Hoffman and V. Chenthamarakshan
and K. R. Varshney",
title = "Fairness {GAN}: Generating datasets with fairness
properties using a generative adversarial network",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "3:1--3:9",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945519",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Decision making; Employment; Gallium nitride;
Generative adversarial networks; Generators; Sports;
Training",
}
@Article{Bellamy:2019:AFE,
author = "R. K. E. Bellamy and K. Dey and M. Hind and S. C.
Hoffman and S. Houde and K. Kannan and P. Lohia and J.
Martino and S. Mehta and A. {Mojsilovi } and S. Nagar
and K. N. Ramamurthy and J. Richards and D. Saha and P.
Sattigeri and M. Singh and K. R. Varshney and Y.
Zhang",
title = "{AI Fairness 360}: An extensible toolkit for detecting
and mitigating algorithmic bias",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "4:1--4:15",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2942287",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Data models; Machine learning
algorithms; Measurement; Open source software;
Pipelines; Prediction algorithms",
}
@Article{Srivastava:2019:RAS,
author = "B. Srivastava and F. Rossi",
title = "Rating {AI} systems for bias to promote trustable
applications",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "5:1--5:9",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2935966",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Buildings; Decision making;
Distortion; Ethics; Presses; Testing",
}
@Article{Arnold:2019:FIT,
author = "M. Arnold and R. K. E. Bellamy and M. Hind and S.
Houde and S. Mehta and A. {Mojsilovi } and R. Nair and
K. N. Ramamurthy and A. Olteanu and D. Piorkowski and
D. Reimer and J. Richards and J. Tsay and K. R.
Varshney",
title = "{FactSheets}: Increasing trust in {AI} services
through supplier's declarations of conformity",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "6:1--6:13",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2942288",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Industries; Safety; Security;
Software; Standards; Testing",
}
@Article{Coates:2019:IEM,
author = "D. L. Coates and A. Martin",
title = "An instrument to evaluate the maturity of bias
governance capability in artificial intelligence
projects",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "7:1--7:15",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2915062",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Ethics; Instruments;
Organizations; Standards organizations",
}
@Article{Rodriguez:2019:BGS,
author = "M. Y. Rodriguez and D. DePanfilis and P. Lanier",
title = "Bridging the gap: Social work insights for ethical
algorithmic decision-making in human services",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "8:1--8:8",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2934047",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Buildings; Context modeling; Decision making;
Prediction algorithms; Predictive models; Resilience",
}
@Article{Simbeck:2019:HAE,
author = "K. Simbeck",
title = "{HR} analytics and ethics",
journal = j-IBM-JRD,
volume = "63",
number = "4--5",
pages = "9:1--9:12",
month = jul,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2915067",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Companies; Data privacy; Ethics; Medical diagnostic
imaging; Medical services; Privacy; Training",
}
@Article{Anonymous:2019:FCd,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "C1--C1",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2948244",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:Ca,
author = "Anonymous",
title = "Cover",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "C2--C2",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2948185",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:TCd,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "1--2",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2948242",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2019:PHA,
author = "Anonymous",
title = "Preface: Hardware for {AI}",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "1--2",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945553",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Cho:2019:BDA,
author = "M. Cho and U. Finkler and M. Serrano and D. Kung and
H. Hunter",
title = "{BlueConnect}: Decomposing all-reduce for deep
learning on heterogeneous network hierarchy",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "1:1--1:11",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947013",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bandwidth; Deep learning; Heterogeneous networks;
Libraries; Neural networks; Synchronization; Training",
}
@Article{Womble:2019:EES,
author = "D. E. Womble and M. Shankar and W. Joubert and J. T.
Johnston and J. C. Wells and J. A. Nichols",
title = "Early experiences on {Summit}: Data analytics and {AI}
applications",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "2:1--2:9",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2944146",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Acceleration; Computational modeling; Data analysis;
Data models; Deep learning; Graphics processing units",
}
@Article{Ghose:2019:PMW,
author = "S. Ghose and A. Boroumand and J. S. Kim and J.
G{\'o}mez-Luna and O. Mutlu",
title = "Processing-in-memory: a workload-driven perspective",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "3:1--3:19",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2934048",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Computers; Memory management; Nonvolatile memory;
Random access memory; Technological innovation;
Through-silicon vias",
}
@Article{Mukhopadhyay:2019:HIA,
author = "S. Mukhopadhyay and Y. Long and B. Mudassar and C. S.
Nair and B. H. DeProspo and H. M. Torun and M.
Kathaperumal and V. Smet and D. Kim and S. Yalamanchili
and M. Swaminathan",
title = "Heterogeneous integration for artificial intelligence:
Challenges and opportunities",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "4:1--4:1",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947373",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Bandwidth; Computer architecture; Copper; Fabrication;
Glass; Silicon; Substrates",
}
@Article{Iyer:2019:SIF,
author = "S. S. Iyer and S. Jangam and B. Vaisband",
title = "Silicon interconnect fabric: a versatile heterogeneous
integration platform for {AI} systems",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "5:1--5:16",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2940427",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial intelligence; Bandwidth; Complexity theory;
Google; Packaging; Silicon; Wiring",
}
@Article{Amid:2019:CDD,
author = "A. Amid and K. Kwon and A. Gholami and B. Wu and K.
{Asanovi } and K. Keutzer",
title = "Co-design of deep neural nets and neural net
accelerators for embedded vision applications",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "6:1--6:14",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2942284",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Artificial neural networks; Benchmark testing;
Computational modeling; Computer vision; Hardware;
Program processors",
}
@Article{Eleftheriou:2019:DLA,
author = "E. Eleftheriou and M. L. Gallo and S. R. Nandakumar
and C. Piveteau and I. Boybat and V. Joshi and R.
Khaddam-Aljameh and M. Dazzi and I. Giannopoulos and G.
Karunaratne and B. Kersting and M. Stanislavjevic and
V. P. Jonnalagadda and N. Ioannou and K. Kourtis and P.
A. Francese and A. Sebastian",
title = "Deep learning acceleration based on in-memory
computing",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "7:1--7:16",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947008",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Analog memory; Computer architecture; Deep learning;
Neurons; Performance evaluation; Task analysis;
Training",
}
@Article{Chang:2019:AHA,
author = "H. -. Chang and P. Narayanan and S. C. Lewis and N. C.
P. Farinha and K. Hosokawa and C. Mackin and H. Tsai
and S. Ambrogio and A. Chen and G. W. Burr",
title = "{AI} hardware acceleration with analog memory:
Microarchitectures for low energy at high speed",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "8:1--8:14",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2934050",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Arrays; Capacitors; Hardware; Neural networks;
Nonvolatile memory; Throughput; Training",
}
@Article{Fuller:2019:RTN,
author = "E. J. Fuller and Y. Li and C. Bennet and S. T. Keene
and A. Melianas and S. Agarwal and M. J. Marinella and
A. Salleo and A. A. Talin",
title = "Redox transistors for neuromorphic computing",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "9:1--9:9",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2942285",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Capacitors; Electrodes; Field effect transistors;
Logic gates; Memristors; Programming",
}
@Article{Jain:2019:NNA,
author = "S. Jain and A. Ankit and I. Chakraborty and T. Gokmen
and M. Rasch and W. Haensch and K. Roy and A.
Raghunathan",
title = "Neural network accelerator design with resistive
crossbars: Opportunities and challenges",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "10:1--10:13",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947011",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
keywords = "Encoding; Hardware; Performance evaluation;
Programming; Task analysis; Training; Virtual machine
monitors",
}
@Article{Anonymous:2019:C,
author = "Anonymous",
title = "Cover",
journal = j-IBM-JRD,
volume = "63",
number = "6",
pages = "C4--C4",
month = nov,
year = "2019",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2948187",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Mon Jan 20 18:12:12 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:FCa,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "C1--C1",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.2970511",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:TCa,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "1--2",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.2973822",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:PDR,
author = "Anonymous",
title = "Preface: Disaster Response and Management",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "1--3",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.2966837",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Talley:2020:DMD,
author = "J. W. Talley",
title = "Disaster management in the digital age",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "1:1--1:5",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2954412",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Curzon:2020:UAC,
author = "R. E. Curzon and P. Curotto and M. Evason and A.
Failla and P. Kusterer and A. Ogawa and J. Paraszczak
and S. Raghavan",
title = "A unique approach to corporate disaster philanthropy
focused on delivering technology and expertise",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "2:1--2:14",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2960244",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Baxter:2020:QMD,
author = "A. E. Baxter and H. E. {Wilborn Lagerman} and P.
Keskinocak",
title = "Quantitative modeling in disaster management: a
literature review",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "3:1--3:13",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2960356",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Krook:2020:CCD,
author = "D. Krook and S. Malaika",
title = "Call for Code: Developers tackle natural disasters
with software",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "4:1--4:8",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2960241",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Albrecht:2020:NGG,
author = "C. M. Albrecht and B. Elmegreen and O. Gunawan and H.
F. Hamann and L. J. Klein and S. Lu and F. Mariano and
C. Siebenschuh and J. Schmude",
title = "Next-generation geospatial-temporal information
technologies for disaster management",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "5:1--5:12",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.2970903",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Treinish:2020:PIW,
author = "L. Treinish and A. Praino and M. Tewari and B.
Hertell",
title = "Predicting impacts of weather-driven urban disasters
in the current and future climate",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "6:1--6:13",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947016",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nair:2020:MLA,
author = "R. Nair and B. S. Madsen and H. Lassen and S. Baduk
and S. Nagarajan and L. H. Mogensen and R. Novack and
R. Curzon and J. Paraszczak and S. Urbak",
title = "A machine learning approach to scenario analysis and
forecasting of mixed migration",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "7:1--7:7",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2948824",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Enenkel:2020:EDS,
author = "M. Enenkel and R. M. Shrestha and E. Stokes and M.
Rom{\'a}n and Z. Wang and M. T. M. Espinosa and I.
Hajzmanova and J. Ginnetti and P. Vinck",
title = "Emergencies do not stop at night: Advanced analysis of
displacement based on satellite-derived nighttime light
observations",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "8:1--8:12",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2954404",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kreutzer:2020:IHN,
author = "T. Kreutzer and P. Vinck and P. N. Pham and A. An and
L. Appel and E. DeLuca and G. Tang and M. Alzghool and
K. Hachhethu and B. Morris and S. L. Walton-Ellery and
J. Crowley and J. Orbinski",
title = "Improving humanitarian needs assessments through
natural language processing",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "9:1--9:14",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947014",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Murakami:2020:URI,
author = "A. Murakami and T. Nasukawa and K. Watanabe and M.
Hatayama",
title = "Understanding requirements and issues in disaster area
using geotemporal visualization of Twitter analysis",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "10:1--10:8",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2962491",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Allen:2020:CCU,
author = "T. Allen and E. Wells and K. Klima",
title = "Culture and cognition: Understanding public
perceptions of risk and (in)action",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "11:1--11:17",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2952330",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Nagurney:2020:QSC,
author = "A. Nagurney and Q. Qiang",
title = "Quantifying supply chain network synergy for
humanitarian organizations",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "12:1--12:16",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2940430",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Shiri:2020:OOF,
author = "D. Shiri and F. S. Salman",
title = "Online optimization of first-responder routes in
disaster response logistics",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "13:1--13:9",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947002",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dalal:2020:DAW,
author = "S. Dalal and D. Bassu",
title = "Deep analytics for workplace risk and disaster
management",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "14:1--14:9",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945693",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pandey:2020:ECT,
author = "P. Pandey and R. Litoriya",
title = "Elderly care through unusual behavior detection: a
disaster management approach using IoT and
intelligence",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "15:1--15:11",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2947018",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Klima:2020:CWR,
author = "K. Klima and L. {El Gammal} and W. Kong and D.
Prosdocimi",
title = "Creating a water risk index to improve community
resilience",
journal = j-IBM-JRD,
volume = "64",
number = "1/2",
pages = "16:1--16:11",
month = jan # "\slash " # mar,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2945301",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Thu Feb 27 10:00:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:FCb,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "C1--C1",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:TCb,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "1--2",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:PSS,
author = "Anonymous",
title = "Preface: {Summit} and {Sierra} Supercomputers",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "1--4",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Hanson:2020:CSS,
author = "W. A. Hanson",
title = "The {CORAL} supercomputer systems",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "1:1--1:10",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2960220",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Roberts:2020:RIP,
author = "S. Roberts and C. Mann and C. Marroquin",
title = "Redefining {IBM} power system design for {CORAL}",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "2:1--2:10",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Stunkel:2020:HSN,
author = "C. B. Stunkel and R. L. Graham and G. Shainer and M.
Kagan and S. S. Sharkawi and B. Rosenburg and G. A.
Chochia",
title = "The high-speed networks of the {Summit} and {Sierra}
supercomputers",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "3:1--3:10",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Islam:2020:BHP,
author = "R. Islam and G. Shah",
title = "Building a high-performance resilient scalable storage
cluster for {CORAL} using {IBM ESS}",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "4:1--4:9",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tian:2020:SSS,
author = "S. Tian and T. Takken and V. Mahaney and C. Marroquin
and M. Schultz and M. Hoffmeyer and Y. Yao and K.
O'Connell and A. Yuksel and P. Coteus",
title = "{Summit} and {Sierra} supercomputer cooling
solutions",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "5:1--5:12",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Liebsch:2020:CIA,
author = "T. Liebsch",
title = "Concurrent installation and acceptance of {Summit} and
{Sierra} supercomputers",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "6:1--6:8",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Besaw:2020:CSM,
author = "N. Besaw and L. Scheidenbach and J. Dunham and S. Kaur
and A. Ohmacht and F. Pizzano and Y. Park",
title = "Cluster system management",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "7:1--7:9",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Solt:2020:SFT,
author = "D. Solt and J. Hursey and A. Lauria and D. Guo and X.
Guo",
title = "Scalable, fault-tolerant job step management for
high-performance systems",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "8:1--8:9",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sharkawi:2020:CPO,
author = "S. S. Sharkawi and G. A. Chochia",
title = "Communication protocol optimization for enhanced {GPU}
performance",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "9:1--9:9",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Dahm:2020:SCE,
author = "J. P. Dahm and D. F. Richards and A. Black and A. D.
Bertsch and L. Grinberg and I. Karlin and S.
Kokkila-Schumacher and E. A. Le{\'o}n and J. R. Neely
and R. Pankajakshan and O. Pearce",
title = "{Sierra Center of Excellence}: Lessons learned",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "2:1--2:14",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Luo:2020:PEA,
author = "L. Luo and T. P. Straatsma and L. E. A. Suarez and R.
Broer and D. Bykov and E. F. D'Azevedo and S. S. Faraji
and K. C. Gottiparthi and C. {De Graaf} and J. A.
Harris and R. W. A. Havenith and H. J. A. Jensen and W.
Joubert and R. K. Kathir and J. Larkin and Y. W. Li and
D. I. Lyakh and O. E. B. Messer and M. R. Norman and J.
C. Oefelein and R. Sankaran and A. F. Tillack and A. L.
Barnes and L. Visscher and J. C. Wells and M. Wibowo",
title = "Pre-exascale accelerated application development: The
{ORNL Summit} experience",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "11:1--11:21",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.2965881",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bercea:2020:OSS,
author = "G. T. Bercea and A. Bataev and A. E. Eichenberger and
C. Bertolli and J. K. O'Brien",
title = "An open-source solution to performance portability for
{Summit} and {Sierra} supercomputers",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "12:1--12:23",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2955944",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/gnu.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Eichenberger:2020:HCG,
author = "A. E. Eichenberger and G.-T. Bercea and A. Bataev and
L. Grinberg and J. K. O'Brien",
title = "Hybrid {CPU\slash GPU} tasks optimized for concurrency
in {OpenMP}",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "13:1--13:14",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2960245",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/pvm.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Tiotto:2020:OCO,
author = "E. Tiotto and B. Mahjour and W. Tsang and X. Xue and
T. Islam and W. Chen",
title = "{OpenMP 4.5} compiler optimization for {GPU}
offloading",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "14:1--14:11",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2019.2962428",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/pvm.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Beckingsale:2020:UAF,
author = "D. A. Beckingsale and M. J. McFadden and J. P. S. Dahm
and R. Pankajakshan and R. D. Hornung",
title = "{Umpire}: Application-focused management and
coordination of complex hierarchical memory",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "00:1--00:10",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Maerean:2020:TAE,
author = "S. Maerean and E. K. Lee and H.-F. Wen and I. Chung",
title = "Transformation of application enablement tools on
{CORAL} systems",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "16:1--16:12",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Pankajakshan:2020:PSM,
author = "R. Pankajakshan and P.-H. Lin and B. Sj{\"o}green",
title = "Porting a {$3$D} seismic modeling code ({SW4}) to
{CORAL} machines",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "17:1--17:11",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Coletti:2020:TDL,
author = "M. Coletti and A. Fafard and D. Page",
title = "Troubleshooting deep-learner training data problems
using an evolutionary algorithm on {Summit}",
journal = j-IBM-JRD,
volume = "64",
number = "3/4",
pages = "1--12",
month = may # "\slash " # jul,
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Wed Jun 3 18:35:26 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/super.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:FC,
author = "Anonymous",
title = "Front Cover",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "C1--C1",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:TC,
author = "Anonymous",
title = "Table of Contents",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "1--2",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Mauri:2020:MGM,
author = "R. A. Mauri",
title = "Message From the {General Manager, IBM Z}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "1--2",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Anonymous:2020:PIZ,
author = "Anonymous",
title = "Preface: {IBM z15} Design and Technology",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "1--4",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Bieswanger:2020:IZS,
author = "A. Bieswanger and A. Maier and C. Mayer and H. Shah
and J. Candee",
title = "{IBM Z} in a secured hybrid cloud",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "1:1--1:10",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Borntrager:2020:SYC,
author = "C. Borntr{\"a}ger and J. D. Bradbury and R.
B{\"u}ndgen and F. Busaba and L. C. Heller and V.
Mihajlovski",
title = "Secure your cloud workloads with {IBM Secure Execution
for Linux} on {IBM z15} and {LinuxONE III}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "2:1--2:11",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/linux.bib;
https://www.math.utah.edu/pub/tex/bib/unix.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Busby:2020:ICC,
author = "J. A. Busby and E. N. Cohen and E. A. Dames and J.
Doherty and S. Dragone and D. Evans and M. J. Fisher
and N. Hadzic and C. Hagleitner and A. J. Higby and M.
D. Hocker and L. S. Jagich and M. J. Jordan and R.
Kisley and K. D. Lamb and M. D. Marik and J. Mayfield
and T. E. Morris and T. D. Needham and W.
Santiago-Fernandez and V. Urban and T. Visegrady and K.
Werner",
title = "The {IBM 4769} Cryptographic Coprocessor",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "3:1--3:11",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008145",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/cryptography2020.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Driever:2020:SES,
author = "P. G. Driever and R. Hathorn and C. Colonna",
title = "Securing the enterprise {SAN} with {IBM Fibre Channel
Endpoint Security}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "4:1--4:8",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webel:2020:ZSS,
author = "T. Webel and O. Morlok and D. Kiss",
title = "{z15} selfboot and secure boot",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "5:1--5:9",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Surman:2020:SRB,
author = "D. H. Surman and S. Lederer and D. B. Petersen and M.
Gubitz and P. J. Relson",
title = "System Recovery Boost on {IBM z15}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "6:1--6:10",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Saporito:2020:DIZ,
author = "A. Saporito and M. Recktenwald and C. Jacobi and G.
Koch and D. P. D. Berger and R. J. Sonnelitter and C.
R. Walters and J.-S. Lee and C. Lichtenau and U. Mayer
and E. Herkel and S. Payer and S. M. Mueller and V. K.
Papazova and E. M. Ambroladze and T. C. Bronson",
title = "Design of the {IBM z15} microprocessor",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "7:1--7:18",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008119",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Berry:2020:IZP,
author = "C. J. Berry and D. Wolpert and B. Bell and A.
Jatkowski and J. Surprise and G. Strevig and J. Isakson
and O. Geva and B. Deskin and M. Cichanowski and G.
Biran and D. Hamid and C. Cavitt and G. Fredeman and D.
Chidambarrao and B. Bruen and M. Wood and S. Carey and
D. Turner and L. Sigal",
title = "{IBM z15}: Physical design improvements to
significantly increase content in the same technology",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "8:1--8:12",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008099",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Klein:2020:DVD,
author = "M. Klein and A. Misra and B. Abali and P. Sethia and
S. Weishaupt and B. Giamei and M. Farrell and T. J.
Slegel",
title = "Design and verification of {DEFLATE} acceleration as
an architected instruction in {z15}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "9:1--9:10",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008099",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Sofia:2020:IZP,
author = "A. T. Sofia and M. Klein and B. D. Stilwell and S.
Weishaupt and Q. Y. Chen and R. W. S. John",
title = "Integration of {z15} processor-based {DEFLATE}
acceleration into {IBM z/OS}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "10:1--10:8",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008101",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Somasundaram:2020:PPP,
author = "M. Somasundaram and J. P. Kubala and S. E. Lederer and
J. Chan",
title = "Partition placement by {PR\slash SM}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "11:1--11:7",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Guendert:2020:STS,
author = "S. R. Guendert and J. S. Houston and P. A. Wojciak and
S. Cherniak and D. L. Massey",
title = "Sysplex time synchronization using {IEEE 1588
Precision Time Protocol (PTP)}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "12:1--12:9",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008108",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Valentine:2020:DII,
author = "B. D. Valentine and M. A. Clark and B. E. Myers and P.
Callaghan and J. A. Wierbowski and P. J. Clas",
title = "Design innovations for {IBM Z} hardware management
appliance",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "13:1--13:9",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{McCain:2020:IZD,
author = "E. C. McCain and P. Bastien and B. F. Belmar and B.
Bhattacharya and K. K. Cheruiyot and M. Coq and R.
Dartey and K. Deekaram and K. Ghadai and L. D. Lalima
and J. Nettey and A. W. Owolabi and K. Phillips and T.
M. Shiling and D. T. Schroeder and C. Slegel and B.
Steen and D. A. Thorne and E. Venuto and J. D.
Willoughby and D. Yaniv and N. Ziemis",
title = "{IBM Z} development transformation",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "14:1--14:13",
year = "2020",
CODEN = "IBMJAE",
DOI = "https://doi.org/10.1147/JRD.2020.3008122",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Webel:2020:PPM,
author = "T. Webel and P. M. Lobo and T. Strach and P. B.
Parashurama and S. Purushotham and R. Bertran and A.
Buyuktosunoglu",
title = "Proactive power management in {IBM z15}",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "15:1--15:12",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Article{Kostenko:2020:IZI,
author = "W. P. Kostenko and J. G. Torok and D. W. Demetriou",
title = "{IBM z15}: Improved data center density and energy
efficiency, new system packaging, and modeling",
journal = j-IBM-JRD,
volume = "64",
number = "5/6",
pages = "16:1--16:10",
year = "2020",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Fri Aug 28 09:26:17 2020",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
acknowledgement = ack-nhfb,
ajournal = "IBM J. Res. Develop.",
fjournal = "IBM Journal of Research and Development",
journal-URL = "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}
@Book{Buchholz:1962:PCS,
editor = "Werner Buchholz",
title = "Planning a Computer System: {Project Stretch}",
publisher = pub-MCGRAW-HILL,
address = pub-MCGRAW-HILL:adr,
pages = "xvii + 322",
year = "1962",
LCCN = "1876",
bibdate = "Fri Nov 19 10:02:31 MST 2010",
bibsource = "https://www.math.utah.edu/pub/bibnet/authors/t/tukey-john-w.bib;
https://www.math.utah.edu/pub/tex/bib/annhistcomput.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/ieeetranscomput.bib;
library.ox.ac.uk:210/ADVANCE",
note = "This important book is the primary description of the
influential IBM 7030 Stretch computer, written by its
architects. See also a detailed critical review
\cite{Strachey:1962:BRP}.",
URL = "http://ed-thelen.org/comp-hist/IBM-7030-Planning-McJones.pdf",
acknowledgement = ack-nhfb,
remark = "The text of the book is in the public domain, with the
permission of the author in 2003.
See \cite{MacKenzie:1991:IAL} for a remark about the
noisy mode for floating-point arithmetic in the IBM
7030 Stretch. That mode is first mentioned on page 25
of this book, and described in detail on page 102,
which states:
``By definition of ordinary normalized FLP operations,
numbers are frequently extended on the right by
attaching zeros. During addition the n-digit operand
that is not preshifted is extended with n zeros, so as
to provide the extra positions to which the preshifted
operand can be added. Any operand or result that is
shifted left to be normalized requires a corresponding
number of zeros to be shifted in at the right. Both
sets of zeros tend to produce numbers smaller in
absolute value than they would have been if more digits
had been carried. In the noisy mode these numbers are
simply extended with 1's instead of zeros (1's in a
binary machine, 9's in a decimal machine). So all
numbers tend to be too large in absolute value. The
true value, if there had been no significance loss,
should lie between these two extremes. Hence, two runs,
one made without and one made with the noisy mode,
should show differences in result that indicate which
digits may have been affected by significance loss.
The principal weakness of the noisy-mode procedure is
that it requires two runs for the same problem. A much
less important weakness is that the loss of
significance cannot be guaranteed to show up --- it
merely has a very high probability of showing up ---
whereas built-in significance checks can be made
slightly pessimistic, so that actual significance loss
will not be greater than indicated. On the other hand,
little extra hardware and no extra storage are required
for the noisy-mode approach. Furthermore, significance
loss is relatively rare, so that running a problem
twice when Significance loss is suspected does not pose
a serious problem. What is serious is the possibility
of unsuspected significance loss.
In discussions of significance two points are often
overlooked. The first of these is trivial: the best way
of ensuring significant results is to use an adequate
number of fraction digits. The second is almost equally
mundane: for a given procedure, normalized FLP
arithmetic will ordinarily produce the greatest
precision possible for the number of fraction digits
used. Normalized FLP arithmetic has been criticized
with respect to significance loss, because such loss is
not indicated by the creation of leading zeros, as it
is with fixed-point arithmetic. In other words, the
contention is not that normalized FLP arithmetic is
more prone to significance loss than equivalent
fixed-point arithmetic, which would be untrue, but that
an equivalent indication of such loss is not provided.
Loss of significance, however, is also a serious
problem in fixed-point arithmetic; multiplication and
division do not handle it at all correctly by means of
leading zeros. (In particular, fixed-point
multiplication may lead to serious or even total
significance loss, which would not have occurred with
normalized FLP arithmetic: and although leading zeros
in addition and subtraction of fixed-point operands do
give correct significance indications, the use of other
operations and of built-in scaling loops frequently
destroys entirely the leading-zeros method of counting
significance.)''",
subject = "Computer architecture",
tableofcontents = "Foreword v \\
Preface vii \\
1. Project Stretch 1 \\
[by W. Buchholz] \\
2. Architectural Philosophy 5 \\
[by F. P. Brooks, Jr.] \\
2.1. The Two Objectives of Project Stretch 5 \\
2.2. Resources 6 \\
2.3. Guiding Principles 7 \\
2.4. Contemporary Trends in Computer Architecture 10
\\
2.5. Hindsight 15 \\
3. System Summary of IBM 7030 17 \\
[by W. Buchholz] \\
3.1. System Organization 17 \\
3.2. Memory Units 17 \\
3.3. Index Memory 19 \\
3.4. Special Registers 19 \\
3.5. Input and Output Facilities 19 \\
3.6. High-speed Disk Units 20 \\
3.7. Central Processing Unit 20 \\
3.8. Instruction Controls 21 \\
3.9. Index-arithmetic Unit 21 \\
3.10. Instruction Look-ahead 21 \\
3.11. Arithmetic Unit 22 \\
3.12. Instruction Set 24 \\
3.13. Data Arithmetic 24 \\
3.14. Radix-conversion Operations 27 \\
3.15. Connective Operations 27 \\
3.16. Index-arithmetic Operations 27 \\
3.17. Branching Operations 28 \\
3.18. Transmission Operations 28 \\
3.19. Input-Output Operations 29 \\
3.20. New Features 29 \\
3.21. Performance 32 \\
4. Natural Data Units 33 \\
[by G. P. Blaauw, F. P. Brooks, Jr., and W. Buchholz]
\\
4.1. Lengths and Structures of Natural Data Units 33
\\
4.2. Procedures for Specifying Natural Data Units 36
\\
4.3. Data Hierarchies 39 \\
4.4. Classes of Operations 40 \\
5. Choosing a Number Base 42 \\
[by W. Buchholz] \\
5.1. Introduction 42 \\
5.2. Information Content 45 \\
5.3. Arithmetic Speed 49 \\
5.4. Numerical Data 50 \\
5.5. Nonnumerical Data 51 \\
5.6. Addresses 52 \\
5.7. Transformation 53 \\
5.8. Partitioning of Memory 54 \\
5.9. Program Interpretation 56 \\
5.10. Other Number Bases 58 \\
5.11. Conclusion 58 \\
6. Character Set 60 \\
[by R. W. Bemer and W. Buchholz] \\
6.1. Introduction 60 \\
6.2. Size of Set 62 \\
6.3. Subsets 62 \\
6.4. Expansion of Set 63 \\
6.5. Code 63 \\
6.6. Parity Bit 66 \\
6.7. Sequence 66 \\
6.8. Blank 67 \\
6.9. Decimal Digits 68 \\
6.10. Typewriter Keyboard 68 \\
6.11. Adjacency 69 \\
6.12. Uniqueness 69 \\
6.13. Signs 70 \\
6.14. Tape-recording Convention 71 \\
6.15. Card-punching Convention 71 \\
6.16. List of 7030 Character Set 72 \\
7. Variable-field-length Operation 75 \\
[by G. P. Blaauw, F. P. Brooks, Jr., and W. Buchholz]
\\
7.1. Introduction 75 \\
7.2. Addressing of Variable-field-length Data 76 \\
7.3. Field Length 77 \\
7.4. Byte Size 78 \\
7.5. Universal Accumulator 79 \\
7.6. Accumulator Operand 79 \\
7.7. Binary and Decimal Arithmetic 80 \\
7.8. Integer Arithmetic 81 \\
7.9. Numerical Signs 82 \\
7.10. Indicators 84 \\
7.11. Arithmetical Operations 85 \\
7.12. Radix-conversion Operation 87 \\
7.13. Logical Connectives of Two Variables 87 \\
7.14. Connective Operations 89 \\
8. Floating-point Operation 92 \\
[by S. G. Campbell] \\
General Discussion \\
8.1. Problems of Fixed-point Arithmetic 92 \\
8.2. Floating-point Arithmetic 94 \\
8.3. Normalization 97 \\
8.4. Floating-point Singularities 98 \\
8.5. Range and Precision 99 \\
8.6. Round-off Error 100 \\
8.7. Significance Checks 101 \\
8.8. Forms of Floating-point Arithmetic 103 \\
8.9. Structure of Floating-point Data 104 \\
Floating-point Features of the 7030 \\
8.10. Floating-point Instruction Format 106 \\
8.11. Floating-point Data Formats 106 \\
8.12. Singular Floating-point Numbers 108 \\
8.13. Indicators 112 \\
8.14. Universal Accumulator 113 \\
8.15. Fraction Arithmetic 114 \\
8.16. Floating-point-arithmetic Operations 114 \\
8.17. Fixed-point Arithmetic Using Unnormalized \\
Floating-point Operations 118 \\
8.18. Special Functions and Forms of Arithmetic 119 \\
8.19. Multiple-precision Arithmetic 119 \\
8.20. General Remarks 121 \\
9. Instruction Formats 122 \\
[by W. Buchholz] \\
9.1. Introduction 122 \\
9.2. Earlier Instruction Languages 122 \\
9.3. Evolution of the Single-address Instruction 124
\\
9.4. Implied Addresses 125 \\
9.5. Basic 7030 Instruction Formats 126 \\
9.6. Instruction Efficiency 127 \\
9.7. The Simplicity of Complexity 131 \\
9.8. Relationship to Automatic Programming Languages
132 \\
10. Instruction Sequencing 133 \\
[by F. P. Brooks, Jr.] \\
10.1. Modes of Instruction Sequencing 133 \\
10.2. Instruction Counter 134 \\
10.3. Unconditional Branching 135 \\
10.4. Conditional Branching 136 \\
10.5. Program-interrupt System 136 \\
10.6. Components of the Program-interrupt System 137
\\
10.7. Examples of Program-interrupt Techniques 140 \\
10.8. Execute Instructions 146 \\
10.9. Execute Operations in the 7030 148 \\
11. Indexing 150 \\
[by G. P. Blaauw] \\
11.1. Introduction 150 \\
11.2. Indexing Functions 151 \\
11.3. Instruction Format for Indexing 155 \\
11.4. Incrementing 157 \\
11.5. Counting 159 \\
11.6. Advancing by One 161 \\
11.7. Progressive Indexing 161 \\
11.8. Data Transmission 162 \\
11.9. Data Ordering 163 \\
11.10. Refilling 165 \\
11.11. Indirect Addressing and Indirect Indexing 167
\\
11.12. Indexing Applications 169 \\
11.13. Record-handling Applications 172 \\
11.14. File Maintenance 175 \\
11.15. Subroutine Control 177 \\
11.16. Conclusion 178 \\
12. Input-Output Control 179 \\
[by W. Buchholz] \\
12.1. A Generalized Approach to Connecting \\
Input-Output and External Storage 179 \\
12.2. Input-Output Instructions 180 \\
12.3. Defining the Memory Area 181 \\
12.4. Writing and Reading 182 \\
12.5. Controlling and Locating 183 \\
12.6. An Alternative Approach 184 \\
12.7. Program Interruptions 184 \\
12.8. Buffering 180 \\
12.9. Interface 188 \\
12.10. Operator Control of Input-Output Units 190 \\
13. Multiprogramming 192 \\
[by E. F. Codd, E. S. Lowry, E. McDonough, and C. A.
Scalzi] \\
13.1. Introduction 192 \\
13.2. Multiprogramming Requirements 193 \\
13.3. 7030 Features that Assist Multiprogramming 195
\\
13.4. Programmed Logic 197 \\
13.5. Concluding Remarks 200 \\
13.6. References 201 \\
14. The Central Processing Unit 202 \\
[by E. Bloch] \\
14.1. Concurrent System Operation 202 \\
14.2. Concurrency within the Central Processing Unit
204 \\
14.3. Data Flow 204 \\
14.4. Arithmetic Unit 208 \\
14.5. Checking 216 \\
14.6. Component Count 216 \\
14.7. Performance 217 \\
14.8. Circuits 218 \\
14.9. Packaging 223 \\
15. The Look-ahead Unit 228 \\
[by R. S. Balance, J. Cocke, and H. G. Kolsky] \\
15.1. General Description 228 \\
15.2. Timing-simulation Program 230 \\
15.3. Description of the Look-ahead Unit 238 \\
15.4. Forwarding 240 \\
15.5. Counter Sequences 241 \\
15.6. Recovery after Interrupt 246 \\
15.7. A Look-back at the Look-ahead 247 \\
16. The Exchange 248 \\
[by W. Buchholz] \\
16.1. General Description 248 \\
16.2. Starting a WRITE or READ Operation 250 \\
16.3. Data Transfer during Writing 250 \\
16.4. Data Transfer during Reading 251 \\
16.5. Terminating a WRITE or READ Operation 252 \\
16.6. Multiple Operations 252 \\
16.7. CONTROL and LOCATE Operations 252 \\
16.8. Interrogating the Control Word 253 \\
16.9. Forced Termination 253 \\
17. A Nonarithmetical System Extension 254 \\
[by S. G. Campbell, P. S. Herwitz, and J. H. Pomerene]
\\
17.1. Nonarithmetical Processing 254 \\
17.2. The Set-up Mode 258 \\
17.3. Byte-sequence Formation 259 \\
17.4. Pattern Selection 260 \\
17.5. Transformation Facilities 261 \\
17.6. Statistical Aids 263 \\
17.7. The BYTE-BY-BYTE Instruction 263 \\
17.8. Monitoring for Special Conditions 264 \\
17.9. Instruction Set 265 \\
17.10. Collating Operations 266 \\
17.11. Table Look-up Operations 267 \\
17.12. Example 267 \\
Appendix A. Summary Data 273 \\
A.1. List of the Larger IBM Stored-program Computers
273 \\
A.2. Instruction Formats 275 \\
A.3. List of Registers and Special Addresses 276 \\
A.4. Summary of Operations and Modifiers 277 \\
A.5. Summary of Indicators 287 \\
Appendix B. Programming Examples 292 \\
Notation 292 \\
B.1. Polynomial Evaluation 295 \\
B.2. Cube-root Extraction 296 \\
B.3. Matrix Multiplication 298 \\
B.4. Conversion of Decimal Numbers to a \\
Floating-point Normalized Vector 299 \\
B.5. Editing a Typed Message 301 \\
B.6. Transposition of a Large Bit Matrix 303 \\
Index 305",
}
@Article{Strachey:1962:BRP,
author = "Christopher Strachey",
title = "Book Reviews: {{\booktitle{Planning a Computer System:
Project Stretch}}. Edited by Werner Buchholz. 322
pp.(London: McGraw-Hill)}",
journal = j-COMP-J,
volume = "5",
number = "2",
pages = "152--153",
month = aug,
year = "1962",
CODEN = "CMPJA6",
DOI = "https://doi.org/10.1093/comjnl/5.2.152",
ISSN = "0010-4620 (print), 1460-2067 (electronic)",
ISSN-L = "0010-4620",
bibdate = "Wed Sep 25 09:59:25 2024",
bibsource = "https://www.math.utah.edu/pub/bibnet/authors/t/tukey-john-w.bib;
https://www.math.utah.edu/pub/tex/bib/annhistcomput.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/ieeetranscomput.bib",
note = "See \cite{Buchholz:1962:PCS}.",
acknowledgement = ack-nhfb,
fjournal = "The Computer Journal",
journal-URL = "http://comjnl.oxfordjournals.org/",
keywords = "IBM 7030 (Stretch); IBM 7950 (Harvest)",
}
@Article{Landauer:1996:CSV,
author = "R. Landauer",
title = "Comment: {``Spatial variation of currents and fields
due to localized scatterers in metallic conduction''
[IBM J. Res. Develop. {\bf 1} (1957), 223--231; {MR \bf
19}, 805g]. With a reprint of the 1957 original}",
journal = j-J-MATH-PHYS,
volume = "37",
number = "10",
pages = "5259--5268",
month = oct,
year = "1996",
CODEN = "JMAPAQ",
ISSN = "0022-2488 (print), 1089-7658 (electronic), 1527-2427",
ISSN-L = "0022-2488",
MRclass = "82D35 (82C70)",
MRnumber = "1 411 629",
bibdate = "Fri Oct 20 17:52:03 2000",
bibsource = "http://www.aip.org/ojs/jmp.html;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/jmathphys1995.bib",
note = "See \cite{Landauer:2000:SVC}.",
acknowledgement = ack-nhfb,
fjournal = "Journal of Mathematical Physics",
journal-URL = "http://jmp.aip.org/",
}
@Article{Clinger:1990:HRF,
author = "William D. Clinger",
title = "How to Read Floating Point Numbers Accurately",
journal = j-SIGPLAN,
volume = "25",
number = "6",
pages = "92--101",
month = jun,
year = "1990",
CODEN = "SINODQ",
DOI = "https://doi.org/10.1145/93548.93557",
ISBN = "0-89791-364-7",
ISBN-13 = "978-0-89791-364-5",
ISSN = "0362-1340 (print), 1523-2867 (print), 1558-1160
(electronic)",
ISSN-L = "0362-1340",
bibdate = "Sun Dec 14 09:15:53 MST 2003",
bibsource = "Compendex database;
ftp://garbo.uwasa.fi/pc/doc-soft/fpbiblio.txt;
http://portal.acm.org/;
http://www.acm.org/pubs/contents/proceedings/pldi/93542/;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/sigplan1990.bib",
note = "See also output algorithms in
\cite{Knuth:1990:SPW,Steele:1990:HPF,Burger:1996:PFP,Abbott:1999:ASS,Steele:2004:RHP}.",
URL = "http://www.acm.org:80/pubs/citations/proceedings/pldi/93542/p92-clinger/",
abstract = "Consider the problem of converting decimal scientific
notation for a number into the best binary floating
point approximation to that number, for some fixed
precision. This problem cannot be solved using
arithmetic of any fixed precision. Hence the IEEE
Standard for Binary Floating-Point Arithmetic does not
require the result of such a conversion to be the best
approximation. This paper presents an efficient
algorithm that always finds the best approximation. The
algorithm uses a few extra bits of precision to compute
an IEEE-conforming approximation while testing an
intermediate result to determine whether the
approximation could be other than the best. If the
approximation might not be the best, then the best
approximation is determined by a few simple operations
on multiple-precision integers, where the precision is
determined by the input. When using 64 bits of
precision to compute IEEE double precision results, the
algorithm avoids higher-precision arithmetic over 99\%
of the time.",
acknowledgement = ack-nhfb # " and " # ack-nj,
affiliation = "Oregon Univ., Eugene, OR, USA",
classification = "722; 723; C1160 (Combinatorial mathematics); C5230
(Digital arithmetic methods); C7310 (Mathematics)",
confdate = "20-22 June 1990",
conference = "Proceedings of the ACM SIGPLAN '90 Conference on
Programming Language Design and Implementation",
conferenceyear = "1990",
conflocation = "White Plains, NY, USA",
confsponsor = "ACM",
fjournal = "ACM SIGPLAN Notices",
journal-URL = "http://portal.acm.org/browse_dl.cfm?idx=J706",
journalabr = "SIGPLAN Not",
keywords = "algorithms; Best binary floating point approximation;
Computer Programming Languages; Computers, Digital ---
Computational Methods; Decimal scientific notation;
Design; Efficient algorithm; experimentation; Fixed
precision; Floating point numbers; Floating Point
Numbers; Higher-precision arithmetic; IEEE double
precision results; IEEE Standard; IEEE-conforming
approximation; Intermediate result; Multiple-precision
integers",
meetingaddress = "White Plains, NY, USA",
meetingdate = "Jun 20--22 1990",
sponsor = "Assoc for Computing Machinery, Special Interest Group
on Programming Languages",
subject = "{\bf F.2.1} Theory of Computation, ANALYSIS OF
ALGORITHMS AND PROBLEM COMPLEXITY, Numerical Algorithms
and Problems. {\bf G.1.0} Mathematics of Computing,
NUMERICAL ANALYSIS, General, Computer arithmetic. {\bf
G.1.2} Mathematics of Computing, NUMERICAL ANALYSIS,
Approximation.",
thesaurus = "Digital arithmetic; Mathematics computing; Number
theory; Standards",
}
@Article{Steele:1990:HPF,
author = "Guy L. {Steele Jr.} and Jon L. White",
title = "How to Print Floating-Point Numbers Accurately",
journal = j-SIGPLAN,
volume = "25",
number = "6",
pages = "112--126",
month = jun,
year = "1990",
CODEN = "SINODQ",
DOI = "https://doi.org/10.1145/93548.93559",
ISBN = "0-89791-364-7",
ISBN-13 = "978-0-89791-364-5",
ISSN = "0362-1340 (print), 1523-2867 (print), 1558-1160
(electronic)",
ISSN-L = "0362-1340",
bibdate = "Sun Dec 14 09:15:53 MST 2003",
bibsource = "Compendex database; http://portal.acm.org/;
http://www.acm.org/pubs/contents/proceedings/pldi/93542/;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/sigplan1990.bib",
note = "See also input algorithm in
\cite{Clinger:1990:HRF,Clinger:2004:RHR}, and a faster
output algorithm in \cite{Burger:1996:PFP} and
\cite{Knuth:1990:SPW}, IBM S/360 algorithms in
\cite{Abbott:1999:ASS} for both IEEE 754 and S/360
formats, and a twenty-year retrospective in
\cite{Steele:2004:RHP}. In electronic mail dated Wed,
27 Jun 1990 11:55:36 EDT, Guy Steele reported that an
intrepid pre-SIGPLAN 90 conference implementation of
what is stated in the paper revealed 3 mistakes:
\begin{itemize} \item[1.] Table~5 (page 124):\par
\noindent insert {\tt k <-- 0} after assertion, and
also delete {\tt k <-- 0} from Table~6. \item[2.]
Table~9 (page 125):\par \noindent \begin{tabular} {ll}
for & {\tt -1:USER!({"}{"});} \\
substitute & {\tt -1:USER!({"}0{"});} \end{tabular}\par
\noindent and delete the comment. \item[3.] Table~10
(page 125):\par \noindent \begin{tabular}{ll} for &
{\tt fill(-k, "0")}\\
substitute & {\tt fill(-k-1, "0")} \end{tabular}
\end{itemize}
\def\EatBibTeXPeriod#1{\ifx#1.\else#1\fi}\EatBibTeXPeriod",
URL = "http://www.acm.org:80/pubs/citations/proceedings/pldi/93542/p112-steele/",
abstract = "Algorithms are presented for accurately converting
floating-point numbers to decimal representation. The
key idea is to carry along with the computation an
explicit representation of the required rounding
accuracy. The authors begin with the simpler problem of
converting fixed-point fractions. A modification of the
well-known algorithm for radix-conversion of
fixed-point fractions by multiplication explicitly
determines when to terminate the conversion process; a
variable number of digits are produced. They derive two
algorithms for free-format output of floating-point
numbers. Finally, they modify the free-format
conversion algorithm for use in fixed-format
applications. Information may be lost if the fixed
format provides too few digit positions, but the output
is always correctly rounded. On the other hand, no
`garbage digits' are ever produced, even if the fixed
format specifies too many digit positions (intuitively,
the `4/3 prints as 1.333333328366279602' problem does
not occur).",
acknowledgement = ack-nhfb,
affiliation = "Thinking Machines Corp",
affiliationaddress = "Cambridge, MA, USA",
classification = "722; 723; C5230 (Digital arithmetic methods); C7310
(Mathematics)",
confdate = "20-22 June 1990",
conference = "Proceedings of the ACM SIGPLAN '90 Conference on
Programming Language Design and Implementation",
conferenceyear = "1990",
conflocation = "White Plains, NY, USA",
confsponsor = "ACM",
fjournal = "ACM SIGPLAN Notices",
journal-URL = "http://portal.acm.org/browse_dl.cfm?idx=J706",
journalabr = "SIGPLAN Not",
keywords = "algorithms; computer programming languages; computers,
digital --- computational methods; conversion process;
decimal floating-point arithmetic; decimal
representation; design; digit positions; explicit
representation; fixed-format applications; fixed-point
fractions; floating point numbers; floating-point
numbers; free-format conversion algorithm; free-format
output; garbage digits; performance; radix-conversion;
rounding accuracy; verification",
remark = "Published as part of the Proceedings of PLDI'90.",
sponsor = "Assoc for Computing Machinery, Special Interest Group
on Programming Languages",
subject = "{\bf F.2.1} Theory of Computation, ANALYSIS OF
ALGORITHMS AND PROBLEM COMPLEXITY, Numerical Algorithms
and Problems. {\bf G.1.0} Mathematics of Computing,
NUMERICAL ANALYSIS, General, Computer arithmetic.",
thesaurus = "Digital arithmetic; Mathematics computing",
xxabstract = "We present algorithms for accurately converting
floating-point numbers to decimal representation. The
key idea is to carry along with the computation an
explicit representation of the required rounding
accuracy. We begin with the simpler problem of
converting fixed-point fractions. A modification of the
well-known algorithm for radix-conversion of
fixed-point fractions by multiplication explicitly
determines when to terminate the conversion process; a
variable number of digits are produced. We then derive
two algorithms for free-format output of floating-point
numbers. Finally, we modify the free-format conversion
algorithm for use in fixed-format applications.",
}
@Article{Burger:1996:PFP,
author = "Robert G. Burger and R. Kent Dybvig",
title = "Printing Floating-Point Numbers Quickly and
Accurately",
journal = j-SIGPLAN,
volume = "31",
number = "5",
pages = "108--116",
month = may,
year = "1996",
CODEN = "SINODQ",
DOI = "https://doi.org/10.1145/231379.231397",
ISSN = "0362-1340 (print), 1523-2867 (print), 1558-1160
(electronic)",
ISSN-L = "0362-1340",
bibdate = "Sun Dec 14 09:17:18 MST 2003",
bibsource = "http://portal.acm.org/;
http://www.acm.org/pubs/contents/proceedings/pldi/231379/;
https://www.math.utah.edu/pub/tex/bib/sigplan1990.bib; https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "This paper offers a significantly faster algorithm
than that of \cite{Steele:1990:HPF}, together with a
correctness proof and an implementation in Scheme. See
also
\cite{Clinger:1990:HRF,Abbott:1999:ASS,Steele:2004:RHP,Clinger:2004:RHR}.",
URL = "http://www.acm.org:80/pubs/citations/proceedings/pldi/231379/p108-burger/",
abstract = "This paper presents a fast and accurate algorithm for
printing floating-point numbers in both free- and
fixed-format modes. In free-format mode, the algorithm
generates the shortest, correctly rounded output string
that converts to the same number when read back in,
accommodating whatever rounding mode the reader uses.
In fixed-format mode, the algorithm generates a
correctly rounded output string using special \# marks
to denote insignificant trailing digits. For both
modes, the algorithm employs a fast estimator to scale
floating-point numbers efficiently.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Comput. Sci., Indiana Univ., Bloomington, IN,
USA",
annote = "Published as part of the Proceedings of PLDI'96.",
fjournal = "ACM SIGPLAN Notices",
journal-URL = "http://portal.acm.org/browse_dl.cfm?idx=J706",
keywords = "algorithms; design; theory",
subject = "{\bf I.3.3} Computing Methodologies, COMPUTER
GRAPHICS, Picture/Image Generation, Display algorithms.
{\bf F.2.1} Theory of Computation, ANALYSIS OF
ALGORITHMS AND PROBLEM COMPLEXITY, Numerical Algorithms
and Problems. {\bf I.1.2} Computing Methodologies,
SYMBOLIC AND ALGEBRAIC MANIPULATION, Algorithms.",
}
@InCollection{Gries:1990:BDO,
author = "David Gries",
title = "Binary to Decimal, One More Time",
crossref = "Feijen:1990:BOB",
chapter = "16",
pages = "141--148",
year = "1990",
bibdate = "Sat Sep 03 09:41:32 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "This paper presents an alternate proof of Knuth's
algorithm \cite{Knuth:1990:SPW} for conversion between
decimal and fixed-point binary numbers.",
acknowledgement = ack-nhfb,
}
@InCollection{Knuth:1990:SPW,
author = "Donald E. Knuth",
title = "A Simple Program Whose Proof Isn't",
crossref = "Feijen:1990:BOB",
chapter = "27",
pages = "233--242",
year = "1990",
bibdate = "Sat Sep 03 09:42:46 1994",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
note = "This paper discusses the algorithm used in {\TeX} for
converting between decimal and scaled fixed-point
binary values, and for guaranteeing a minimum number of
digits in the decimal representation. See also
\cite{Clinger:1990:HRF} for decimal to binary
conversion, \cite{Steele:1990:HPF} for binary to
decimal conversion, and \cite{Gries:1990:BDO} for an
alternate proof of Knuth's algorithm.",
acknowledgement = ack-nhfb,
}
@Proceedings{Hoffman:1987:MC,
editor = "Alan J. Hoffman and Willard L. Miranker",
booktitle = "Mathematics and Computing",
title = "Mathematics and Computing",
volume = "31(2)",
publisher = pub-IBM,
address = pub-IBM:adr,
pages = "150--260",
month = mar,
year = "1987",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Tue Nov 10 07:52:44 1998",
bibsource = "Compendex database;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
series = j-IBM-JRD,
abstract = "This issue contains 14 papers presented at the
conference. It describes results in differential
equations and statistics, in mathematical programming
and numerical analysis, in approximation theory and
theoretical computer science, in symbolic dynamics and
computing the Fourier Transform. It describes results
in mathematics and the application of mathematics to
other areas. In short, it is a snapshot of the
scientific life of the department. All papers are
separately indexed and abstracted.",
acknowledgement = ack-nhfb,
classification = "721; 723; 912; 921",
conference = "Mathematics and Computing. Symposium Celebrating the
25th Anniversary of the Formation of the Mathematical
Sciences Department of the IBM Thomas J. Watson
Research Center.",
journalabr = "IBM Journal of Research and Development",
keywords = "applied mathematics; computer aided analysis; computer
aided engineering; computer metatheory --- Boolean
Algebra; crystallography; industrial engineering; logic
functions; mathematical techniques --- Applications;
pattern-matching; science",
meetingaddress = "Yorktown Heights, NY, USA",
sponsor = "IBM, Thomas J. Watson Research Cent, Yorktown Heights,
NY, USA",
}
@Proceedings{Anonymous:1989:IEW,
editor = "Anonymous",
booktitle = "{IBM Europe Workshop on High-Temperature
Superconductivity}",
title = "{IBM Europe Workshop on High-Temperature
Superconductivity}",
volume = "33(3)",
publisher = pub-IBM,
address = pub-IBM:adr,
month = may,
year = "1989",
CODEN = "IBMJAE",
ISSN = "0018-8646 (print), 2151-8556 (electronic)",
ISSN-L = "0018-8646",
bibdate = "Sun Sep 15 05:58:06 MDT 1996",
bibsource = "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
series = j-IBM-JRD,
abstract = "The following topics were dealt with: structural,
electronic and magnetic properties; superconducting
coherence lengths; experimental techniques; theoretical
models.",
acknowledgement = ack-nhfb,
classcodes = "A0130C (Conference proceedings); A7470V (Perovskite
phase superconductors)",
classification = "A0130C (Conference proceedings); A7470V (Perovskite
phase superconductors)",
confdate = "8--12 Aug. 1988",
conflocation = "Oberlech, Austria",
conftitle = "IBM Europe Workshop on High-Temperature
Superconductivity",
keywords = "high temperature superconductivity; high-temperature
superconductors",
thesaurus = "High-temperature superconductors",
}
@Article{Jamieson:1989:SNR,
author = "M. J. Jamieson",
title = "Short Notes: Rapidly Converging Iterative Formulae for
Finding Square Roots and their Computational
Efficiencies",
journal = j-COMP-J,
volume = "32",
number = "1",
pages = "93--94",
month = feb,
year = "1989",
CODEN = "CMPJA6",
DOI = "https://doi.org/10.1093/comjnl/32.1.93",
ISSN = "0010-4620 (print), 1460-2067 (electronic)",
ISSN-L = "0010-4620",
MRclass = "65H05",
MRnumber = "89k:65063",
bibdate = "Tue Dec 4 14:48:26 MST 2012",
bibsource = "Compendex database;
http://comjnl.oxfordjournals.org/content/32/1.toc;
https://www.math.utah.edu/pub/bibnet/authors/m/moler-cleve-b.bib;
https://www.math.utah.edu/pub/tex/bib/compj1980.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
http://www3.oup.co.uk/computer_journal/hdb/Volume_32/Issue_01/",
URL = "http://comjnl.oxfordjournals.org/content/32/1/93.full.pdf+html;
http://www3.oup.co.uk/computer_journal/hdb/Volume_32/Issue_01/tiff/93.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_32/Issue_01/tiff/94.tif",
abstract = "A derivation is given of rapidly converging iterative
formulae for finding square roots which include, as
special cases, some recently published examples. Their
computational efficiencies are investigated for
sequential and parallel implementation. It is concluded
that the most efficient method is equivalent to
sequential application of the Newton Raphson formula; a
simple modification is suggested which brings the
advantage of root bracketing at little extra
computational cost.",
acknowledgement = ack-nhfb,
affiliation = "Dept. of Comput. Sci., Glasgow Univ., UK",
affiliationaddress = "Glasgow, Scotl",
classcodes = "B0290F (Interpolation and function approximation);
C4130 (Interpolation and function approximation)",
classification = "723; 921; B0290F (Interpolation and function
approximation); C4130 (Interpolation and function
approximation)",
corpsource = "Dept. of Comput. Sci., Glasgow Univ., UK",
fjournal = "The Computer Journal",
journal-URL = "http://comjnl.oxfordjournals.org/",
keywords = "computational; Computational efficiencies;
Computational Efficiency; Computer Metatheory;
Convergence; convergence of numerical methods;
Converging iterative formulae; converging iterative
formulae; efficiencies; formula; function
approximation; Iterative Methods; iterative methods;
Newton Raphson; Newton Raphson formula, Mathematical
Techniques; Parallel implementation; parallel
implementation; Square Roots; Square roots; square
roots",
thesaurus = "Convergence of numerical methods; Function
approximation; Iterative methods",
treatment = "P Practical",
}
@Book{Feijen:1990:BOB,
editor = "W. H. J. Feijen and A. J. M. van Gasteren and David
Gries and J. Misra",
booktitle = "Beauty is our Business: a Birthday Salute to {Edsger
W. Dijkstra}",
title = "Beauty is our Business: a Birthday Salute to {Edsger
W. Dijkstra}",
publisher = pub-SV,
address = pub-SV:adr,
pages = "xix + 453",
year = "1990",
DOI = "https://doi.org/10.1007/978-1-4612-4476-9",
ISBN = "0-387-97299-4, 3-540-97299-4, 1-4612-8792-8 (print),
1-4612-4476-5 (online)",
ISBN-13 = "978-0-387-97299-2, 978-3-540-97299-0,
978-1-4612-8792-6 (print), 978-1-4612-4476-9 (online)",
ISSN = "0172-603X",
ISSN-L = "0172-603X",
LCCN = "QA76 .B326 1990",
bibdate = "Thu Mar 24 09:27:40 1994",
bibsource = "https://www.math.utah.edu/pub/bibnet/authors/b/bauer-friedrich-ludwig.bib;
https://www.math.utah.edu/pub/bibnet/authors/d/dijkstra-edsger-w.bib;
https://www.math.utah.edu/pub/bibnet/authors/h/hoare-c-a-r.bib;
https://www.math.utah.edu/pub/tex/bib/fparith.bib;
https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
https://www.math.utah.edu/pub/tex/bib/master.bib;
https://www.math.utah.edu/pub/tex/bib/texbook3.bib",
note = "Contains important treatment of accurate
binary-to-decimal conversion
\cite{Gries:1990:BDO,Knuth:1990:SPW}.",
URL = "http://www.zentralblatt-math.org/zmath/en/search/?an=0718.68004",
acknowledgement = ack-nhfb,
tableofcontents = "Anonymous / Front Matter / i--xix \\
Krzysztof R. Apt, Frank S. de Boer, Ernst-R{\"u}diger
Olderog / Proving Termination of Parallel Programs /
1--6 / doi:10.1007/978-1-4612-4476-9_1 \\
Roland C. Backhouse / On a Relation on Functions /
7--18 / doi:10.1007/978-1-4612-4476-9_2 \\
F. L. Bauer / Efficient Solution of a Non--Monotonic
Inverse Problem / 19--26 /
doi:10.1007/978-1-4612-4476-9_3 \\
A. Bijlsma / Semantics of Quasi--Boolean Expressions /
27--35 / doi:10.1007/978-1-4612-4476-9_4 \\
Richard S. Bird / Small Specification Exercises /
36--43 / doi:10.1007/978-1-4612-4476-9_5 \\
Maarten Boasson / Architecture of Real--Time Systems /
44--53 / doi:10.1007/978-1-4612-4476-9_6 \\
Robert S. Boyer, Milton W. Green, J Strother Moore /
The Use of a Formal Simulator to Verify a Simple Real
Time Control Program / 54--66 /
doi:10.1007/978-1-4612-4476-9_7 \\
Donald W. Braben / Exploring the Future: Trends and
Discontinuities / 67--75 /
doi:10.1007/978-1-4612-4476-9_8 \\
Coen Bron / On a Renewed Visit to the Banker and a
Remarkable Analogy / 76--82 /
doi:10.1007/978-1-4612-4476-9_9 \\
Manfred Broy / On Bounded Buffers: Modularity,
Robustness, and Reliability in Reactive Systems /
83--93 / doi:10.1007/978-1-4612-4476-9_10 \\
K. Mani Chandy, Stephen Taylor / Examples in Program
Composition / 94--101 /
doi:10.1007/978-1-4612-4476-9_11 \\
Albert J. Dijkstra / On the Mechanism of the
Hydrogenation of Edible Oils / 102--111 /
doi:10.1007/978-1-4612-4476-9_12 \\
W. H. J. Feijen, A. J. M. van Gasteren, D. Gries, J.
Misra / The Problem of the Majority Network / 112--118
/ doi:10.1007/978-1-4612-4476-9_13 \\
W. H. J. Feijen / A Little Exercise in Deriving
Multiprograms / 119--126 /
doi:10.1007/978-1-4612-4476-9_14 \\
A. J. M. van Gasteren / Experimenting with a Refinement
Calculus / 127--134 / doi:10.1007/978-1-4612-4476-9_15
\\
Mohamed G. Gouda / Serializable Programs,
Parallelizable Assertions: A Basis for Interleaving /
135--140 / doi:10.1007/978-1-4612-4476-9_16 \\
David Gries / Binary to Decimal, One More Time /
141--148 / doi:10.1007/978-1-4612-4476-9_17 \\
A. N. Habermann / Rotate and Double / 149--162 /
doi:10.1007/978-1-4612-4476-9_18 \\
Eric C. R. Hehner / Beautifying G{\"o}del / 163--172 /
doi:10.1007/978-1-4612-4476-9_19 \\
G. Helmberg / A Striptease of Entropy / 173--175 /
doi:10.1007/978-1-4612-4476-9_20 \\
Ted Herman / On a Theorem of Jacobson / 176--181 /
doi:10.1007/978-1-4612-4476-9_21 \\
Wim H. Hesselink / Modalities of Nondeterminacy /
182--192 / doi:10.1007/978-1-4612-4476-9_22 \\
C. A. R. Hoare / A Theory for the Derivation of C-mos
Circuit Designs / 193--205 /
doi:10.1007/978-1-4612-4476-9_23 \\
Rob Hoogerwoord / On Mathematical Induction and the
Invariance Theorem / 206--211 /
doi:10.1007/978-1-4612-4476-9_24 \\
J. J. Horning / Formalizing Some Classic
Synchronization Primitives / 212--219 /
doi:10.1007/978-1-4612-4476-9_25 \\
Cliff B. Jones / Consequences / 220--225 /
doi:10.1007/978-1-4612-4476-9_26 \\
Anne Kaldewaij / Shortest and Longest Segments /
226--232 / doi:10.1007/978-1-4612-4476-9_27 \\
Donald E. Knuth / A Simple Program Whose Proof Isn't /
233--242 / doi:10.1007/978-1-4612-4476-9_28 \\
Vadim E. Kotov / Binding Structure and Behaviour in
``Whole Net'' Concurrency Semantics / 243--250 /
doi:10.1007/978-1-4612-4476-9_29 \\
F. E. J. Kruseman Aretz / Maximal Strong Components: An
Exercise in Program Presentation / 251--261 /
doi:10.1007/978-1-4612-4476-9_30 \\
Christian Lengauer, Duncan G. Hudson / A Systolic
Program for Gauss--Jordan Elimination / 262--273 /
doi:10.1007/978-1-4612-4476-9_31 \\
J. H. van Lint / Coding for Channels with Localized
Errors / 274--279 / doi:10.1007/978-1-4612-4476-9_32
\\
Johan J. Lukkien, Jan L. A. van de Snepscheut /
Topology-Independent Algorithms Based on Spanning Trees
/ 280--288 / doi:10.1007/978-1-4612-4476-9_33 \\
Zohar Manna, Amir Pnueli / An Exercise in the
Verification of Multi--Process Programs / 289--301 /
doi:10.1007/978-1-4612-4476-9_34 \\
Alain J. Martin / The Limitations to
Delay--Insensitivity in Asynchronous Circuits /
302--311 / doi:10.1007/978-1-4612-4476-9_35 \\
Jayadev Misra / A Simple Proof of a Simple Consensus
Algorithm / 312--318 / doi:10.1007/978-1-4612-4476-9_36
\\
Carroll Morgan / Of wp and {CSP} / 319--326 /
doi:10.1007/978-1-4612-4476-9_37 \\
Joseph M. Morris / Programming by Expression
Refinement: the {KMP} Algorithm / 327--338 /
doi:10.1007/978-1-4612-4476-9_38 \\
Greg Nelson / Methodical Competitive Snoopy--Caching /
339--345 / doi:10.1007/978-1-4612-4476-9_39 \\
Peter G. Neumann / Beauty and the Beast of Software
Complexity Elegance versus Elephants / 346--351 /
doi:10.1007/978-1-4612-4476-9_40 \\
W. Peremans / A Note on Feasibility / 352--355 /
doi:10.1007/978-1-4612-4476-9_41 \\
Karel A. Post / A Curious Property of Points and
Circles in the Plane / 356--357 /
doi:10.1007/978-1-4612-4476-9_42 \\
Paul Pritchard / A Problem Involving Subsequences /
358--364 / doi:10.1007/978-1-4612-4476-9_43 \\
Martin Rem / A Personal Perspective of the
Alpern--Schneider Characterization of Safety and
Liveness / 365--372 / doi:10.1007/978-1-4612-4476-9_44
\\
Fred B. Schneider / Simpler Proofs for Concurrent
Reading and Writing / 373--379 /
doi:10.1007/978-1-4612-4476-9_45 \\
Carel S. Scholten / Goodbye Junctivity? / 380--385 /
doi:10.1007/978-1-4612-4476-9_46 \\
Henk C. A. van Tilborg / An Assignment Problem for the
Vertices of a Cycle / 386--389 /
doi:10.1007/978-1-4612-4476-9_47 \\
D. A. Turner / Duality and De Morgan Principles for
Lists / 390--398 / doi:10.1007/978-1-4612-4476-9_48 \\
W. M. Turski / The Quest for Timeless Specifications
Leads to Non--Stepping Automata / 399--409 /
doi:10.1007/978-1-4612-4476-9_49 \\
Jan Tijmen Udding / The Maximum Length of a Palindrome
in a Sequence / 410--416 /
doi:10.1007/978-1-4612-4476-9_50 \\
Lincoln A. Wallen / On Form, Formalism and Equivalence
/ 417--426 / doi:10.1007/978-1-4612-4476-9_51 \\
N. Wirth / Drawing Lines, Circles, and Ellipses in a
Raster / 427--434 / doi:10.1007/978-1-4612-4476-9_52
\\
Jaap van der Woude / Calculations with Relations, an
Example / 435--441 / doi:10.1007/978-1-4612-4476-9_53
\\
Heinz Zemanek / Two Proofs for Pythagoras / 442--447 /
doi:10.1007/978-1-4612-4476-9_54 \\
Anonymous / Back Matter / 448--453",
}