%%% -*-BibTeX-*-
%%% ====================================================================
%%%  BibTeX-file{
%%%     author          = "Nelson H. F. Beebe",
%%%     version         = "1.150",
%%%     date            = "21 October 2023",
%%%     time            = "15:43:34 MDT",
%%%     filename        = "ibmjrd.bib",
%%%     address         = "University of Utah
%%%                        Department of Mathematics, 110 LCB
%%%                        155 S 1400 E RM 233
%%%                        Salt Lake City, UT 84112-0090
%%%                        USA",
%%%     telephone       = "+1 801 581 5254",
%%%     FAX             = "+1 801 581 4148",
%%%     URL             = "https://www.math.utah.edu/~beebe",
%%%     checksum        = "26709 140314 669849 6722387",
%%%     email           = "beebe at math.utah.edu, beebe at acm.org,
%%%                        beebe at computer.org (Internet)",
%%%     codetable       = "ISO/ASCII",
%%%     keywords        = "bibliography; bibliography; IBM Journal of
%%%                        Research and Development",
%%%     license         = "public domain",
%%%     supported       = "yes",
%%%     docstring       = "This file contains a bibliography for the
%%%                        IBM Journal of Research and Development
%%%                        (CODEN IBMJAE, ISSN 0018-8646) covering
%%%                        (incompletely) 1957 -- date.  The initial
%%%                        draft was extracted from the ACM Computing
%%%                        Archive CD ROM for the 1980s, with manual
%%%                        corrections and additions.
%%%
%%%                        There is a 50-th anniversary collection of
%%%                        articles from IBM journals at
%%%
%%%                            http://www.research.ibm.com/journal/50th/
%%%
%%%                        In 2010, the IBM journals archive was moved
%%%                        to the IEEE eXplore digital library:
%%%
%%%                            http://www.almaden.ibm.com/journal
%%%                            http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520
%%%
%%%                        At version 1.150, the year coverage looked
%%%                        like this:
%%%
%%%                             1957 (  73)    1979 (  65)    2001 (  64)
%%%                             1958 (  58)    1980 (  73)    2002 (  57)
%%%                             1959 (  55)    1981 (  75)    2003 (  53)
%%%                             1960 (  84)    1982 (  73)    2004 (  48)
%%%                             1961 (  48)    1983 (  58)    2005 (  72)
%%%                             1962 (  78)    1984 (  72)    2006 (  54)
%%%                             1963 (  65)    1985 (  52)    2007 (  61)
%%%                             1964 (  85)    1986 (  63)    2008 (  61)
%%%                             1965 (  61)    1987 (  57)    2009 (  77)
%%%                             1966 (  77)    1988 (  64)    2010 (  52)
%%%                             1967 (  87)    1989 (  57)    2011 (  35)
%%%                             1968 (  23)    1990 (  77)    2012 (  73)
%%%                             1969 (  89)    1991 (  59)    2013 (  60)
%%%                             1970 (  90)    1992 (  71)    2014 (  73)
%%%                             1971 (  53)    1993 (  51)    2015 (  72)
%%%                             1972 (  67)    1994 (  68)    2016 (  62)
%%%                             1973 (  47)    1995 (  57)    2017 (  58)
%%%                             1974 (  58)    1996 (  54)    2018 (  58)
%%%                             1975 (  60)    1997 (  61)    2019 (  50)
%%%                             1976 (  55)    1998 (  75)    2020 (  60)
%%%                             1977 (  57)    1999 (  63)
%%%                             1978 (  71)    2000 (  76)
%%%
%%%                             Article:       4056
%%%                             Book:             2
%%%                             InCollection:     2
%%%                             Proceedings:      2
%%%
%%%                             Total entries: 4062
%%%
%%%                        Recent additions have been extracted from
%%%                        material at the journal's World-Wide Web
%%%                        site:
%%%
%%%                            http://www.almaden.ibm.com/journal
%%%
%%%                        Unfortunately, that otherwise very useful
%%%                        resource does not yet include article page
%%%                        ranges.
%%%
%%%                        For version 1.22, the results of a search
%%%                        in the OCLC Contents1st database resulted
%%%                        in the addition of 219 new entries, after
%%%                        conversion to BibTeX form, followed by
%%%                        extensive editing and correction.  About
%%%                        100 previously-existing entries were also
%%%                        updated with new data.  At version 1.33,
%%%                        following a search of the IEEE INSPEC
%%%                        (1989--1995) database, 62 new entries were
%%%                        added, and many others were extended.  At
%%%                        version 1.38, a search of the American
%%%                        Mathematical Society MathSciNet database
%%%                        produced 227 new entries.  At version 1.40,
%%%                        a search of the Compendex databases for
%%%                        1970--1989 produced 712 new entries.  At
%%%                        version 1.45, a search of the IEEE INSPEC
%%%                        (1970--1996) database produced 323 new
%%%                        entries.
%%%
%%%                        The IBM Journal of Research and Development
%%%                        averages about 60 articles per year, so
%%%                        the total number of articles published from
%%%                        1957 to 1996 is about 40*60 = 2400.
%%%                        [Reference Hauge:1993:P says 2190 articles
%%%                        to the end of 1993, for a yearly average of
%%%                        59.19.]  At version 1.45, this bibliography
%%%                        contained 1991 entries, for an estimated
%%%                        coverage of 83%.
%%%
%%%                        IBM has kindly given permission to include
%%%                        article abstracts in bibliographic
%%%                        databases, so these have been provided in
%%%                        some cases.  Specifically, their copyright
%%%                        in files at World-Wide Web URL
%%%                        http://www.almaden.ibm.com/journal/ says:
%%%
%%%                            (C) Copyright 1995 by International
%%%                            Business Machines Corporation. See
%%%                            individual articles for copying
%%%                            information. Table of Contents and
%%%                            ``Recent publications by IBM authors''
%%%                            may be freely copied and distributed in
%%%                            any form. ISSN 0018-8646. Printed in
%%%                            U.S.A.
%%%
%%%                        BibTeX citation tags are uniformly chosen
%%%                        as name:year:abbrev, where name is the
%%%                        family name of the first author or editor,
%%%                        year is a 4-digit number, and abbrev is a
%%%                        3-letter condensation of important title
%%%                        words. Citation tags were automatically
%%%                        generated by software developed for the
%%%                        BibNet Project.
%%%
%%%                        In this bibliography, entries are sorted in
%%%                        publication order, using the ``bibsort
%%%                        -byvolume'' utility.
%%%
%%%                        Abstracts of papers starting with Volume 38
%%%                        in 1994 are available via the WorldWide Web
%%%                        at URL http://www.ibm.com/, via the node
%%%                        path Research and Technology -> Technical
%%%                        Journals -> Journal of Research and
%%%                        Development.  All available abstracts have
%%%                        been included in the entries below.
%%%
%%%                        The checksum field above contains a CRC-16
%%%                        checksum as the first value, followed by the
%%%                        equivalent of the standard UNIX wc (word
%%%                        count) utility output of lines, words, and
%%%                        characters.  This is produced by Robert
%%%                        Solovay's checksum utility.",
%%%  }
%%% ====================================================================

@Preamble{
  "\input path.sty "
  #
  "\hyphenation{
                Holtz-berg
                Leh-mann
                Paz-i-en-za
                Por-i-nel-li
                Schles-ing-er
                Scheu-ing
                Sgua-zze-ro
                Yosh-i-mi-ne
               }"
  #
  "\ifx \undefined \TM \def \TM {${}^{\sc TM}$} \fi"
}

%%% ====================================================================
%%% Acknowledgement abbreviations:

@String{ack-nhfb = "Nelson H. F. Beebe,
                    University of Utah,
                    Department of Mathematics, 110 LCB,
                    155 S 1400 E RM 233,
                    Salt Lake City, UT 84112-0090, USA,
                    Tel: +1 801 581 5254,
                    FAX: +1 801 581 4148,
                    e-mail: \path|beebe@math.utah.edu|,
                            \path|beebe@acm.org|,
                            \path|beebe@computer.org| (Internet),
                    URL: \path|https://www.math.utah.edu/~beebe/|"}

@String{ack-nj =      "Norbert Juffa,
                  2445 Mission College Blvd.,
                  Santa Clara, CA 95054,
                  USA,
                  e-mail: \path|norbert@@iit.com|"}

%%% ====================================================================
%%% Journal abbreviations:

@String{j-COMP-J                = "The Computer Journal"}

@String{j-IBM-JRD               = "IBM Journal of Research and Development"}

@String{j-J-MATH-PHYS           = "Journal of Mathematical Physics"}

@String{j-SIGPLAN               = "ACM SIGPLAN Notices"}

%%% ====================================================================
%%% Publisher abbreviations:

@String{pub-IBM                 = "IBM Corporation"}

@String{pub-IBM:adr             = "Armonk, NY, USA"}

@String{pub-MCGRAW-HILL         = "Mc{\-}Graw-Hill"}

@String{pub-MCGRAW-HILL:adr     = "New York, NY, USA"}

@String{pub-SV                  = "Spring{\-}er-Ver{\-}lag"}

@String{pub-SV:adr              = "Berlin, Germany~/ Heidelberg,
                                  Germany~/ London, UK~/ etc."}

%%% ====================================================================
%%% Bibliography entries:

@Article{Anonymous:1957:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "1--1",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1957.5392710",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392710",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cameron:1957:DOB,
  author =       "D. P. Cameron",
  title =        "Domain Orientation in Barium Titanate Single
                 Crystals",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "2--7",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392711",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greanias:1957:DLR,
  author =       "E. C. Greanias and C. J. Hoppel and M. Kloomok and J.
                 S. Osborne",
  title =        "Design of Logic for Recognition of Printed Characters
                 by Simulation",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "8--18",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0008",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392712",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Redfield:1957:TRP,
  author =       "A. G. Redfield",
  title =        "On the Theory of Relaxation Processes",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "19--31",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0019",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392713",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wyma:1957:TDP,
  author =       "E. R. Wyma",
  title =        "A Three-Dimensional Printed Back Panel",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "32--38",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0032",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392714",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swanson:1957:CFO,
  author =       "J. A. Swanson",
  title =        "Clarification of First-Order Semiconduction Effects
                 through Use of Electrochemical Potentials",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "39--43",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0039",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392715",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ittner:1957:SCR,
  author =       "W. B. {Ittner III} and P. J. Magill",
  title =        "A Survey of Contact Resistance Theory for Nominally
                 Clean Surfaces",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "44--48",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0044",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392716",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fitch:1957:DEC,
  author =       "C. J. Fitch",
  title =        "Development of the Electrostatic Clutch",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "49--56",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0049",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392717",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zaromb:1957:ADS,
  author =       "S. Zaromb",
  title =        "An Analysis of Diffusion in Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "57--61",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0057",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392718",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lesser:1957:RAM,
  author =       "M. L. Lesser and J. W. Haanstra",
  title =        "The Random-Access Memory Accounting Machine --- {I}.
                 System Organization of the {IBM 305}",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "62--71",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0062",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392719",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxauthor =     "S. Zaromb",
}

@Article{Noyes:1957:RAM,
  author =       "T. Noyes and W. E. Dickinson",
  title =        "The Random-Access Memory Accounting Machine --- {II}.
                 {The} Magnetic-Disk, Random-Access Memory",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "72--75",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0072",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392720",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Astrahan:1957:LDD,
  author =       "M. M. Astrahan and B. Housman and J. F. Jacobs and R.
                 P. Mayer and W. H. Thomas",
  title =        "Logical design of the digital computer for the {SAGE
                 System}",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "76--83",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0076",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "18,678c",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392721;
                 http://www.research.ibm.com/journal/rd/011/ibmrd0101L.pdf",
  abstract =     "Special design features and performance criteria are
                 described for the logical system in the digital
                 computer used in the SAGE (Semi-Automatic Ground
                 Environment) air defense system. Design details are
                 given for the arithmetic element, high-speed multiply,
                 index registers, input-output control, and magnetic
                 drum buffer. The system is designed according to
                 special military application requirements of speed,
                 capacity, reliability and flexibility. R",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "John W. Carr III",
}

@Article{Gunther-Mohr:1957:SCT,
  author =       "G. R. Gunther-Mohr and S. Triebwasser",
  title =        "Simple Constant-Temperature Oven and Control System",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "84--89",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0084",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392722",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gunther-Moore:1957:SCT,
  author =       "G. R. Gunther-Moore and S. Triebwasser",
  title =        "Simple Constant-Temperature Oven and Control System",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "84--??",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cole:1957:LPZ,
  author =       "H. Cole and F. Chambers and H. Dunn",
  title =        "Lattice Parameters of {Zn$_3$As$_2$}",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "90--92",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0090",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392723",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Horton:1957:GTM,
  author =       "J. W. Horton",
  title =        "A General Theory of Multiple Spin Echoes",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "93--95",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0093",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392724",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "96--97",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0096",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392725",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RPIa,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "96--??",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "98--98",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0098",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392726",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Aa,
  author =       "Anonymous",
  title =        "The Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "1",
  pages =        "99--100",
  month =        jan,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.11.0099",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:30 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392727",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "101--101",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1957.5392729",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392729",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Foss:1957:WMC,
  author =       "E. Foss and R. S. Partridge",
  title =        "A 32,000-Word Magnetic-Core Memory",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "102--109",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0102",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Contains photographs of vacuum-tube memory control
                 system, and a large core panel containing 1KB of
                 memory.",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392730",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kogbetliantz:1957:CUE,
  author =       "E. G. Kogbetliantz",
  title =        "Computation of $e^{N}$ for $-\infty < {N} < +\infty$
                 Using an Electronic Computer",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "110--115",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0110",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,775d",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392731",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. F. Freiberger",
}

@Article{Dunham:1957:MBD,
  author =       "B. Dunham",
  title =        "The Multipurpose Bias Device --- {Part I}: The
                 Commutator Transistor",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "116--129",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0116",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392732",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Peterson:1957:ARA,
  author =       "W. W. Peterson",
  title =        "Addressing for Random-Access Storage",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "130--146",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,69d",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/hash.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "First major paper dealing with the problem of
                 searching in large files. Defined open addressing in
                 general, analyzed the performance of uniform hashing,
                 and the behavior of linear open addressing with various
                 bucket sizes.",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392733",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  country =      "USA",
  date =         "00/00/00",
  descriptor =   "Hash coding",
  enum =         "2417",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  location =     "PKI-OG: Li-Ord.Le",
  references =   "0",
  revision =     "21/04/91",
  town =         "Yorktown Heights",
}

@Article{Price:1957:LN,
  author =       "P. J. Price",
  title =        "The {Lorenz} Number",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "147--157",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0147",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "82.0X",
  MRnumber =     "19,792e",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392734",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P.-O. L{\"o}wdin",
}

@Article{Murphy:1957:PIA,
  author =       "R. W. Murphy",
  title =        "A Positive-Integer Arithmetic for Data Processing",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "158--170",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0158",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "18,939d",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392735;
                 http://www.research.ibm.com/journal/rd/012/ibmrd0102G.pdf",
  abstract =     "It is hypothesized that positive numbers suffice for
                 the expression of quantities in accounting. New
                 arithmetic operations are devised that yield
                 non-negative results in computation, and the
                 applicability of these operations to data processing is
                 studied. These operations permit a wide variety of
                 functions to be computed with fewer and less complex
                 steps and imply the feasibility of constructing less
                 complex data-processing machines.",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "C. C. Gotlieb",
}

@Article{Ghazala:1957:IDC,
  author =       "M. J. Ghazala (Gazale)",
  title =        "Irredundant Disjunctive and Conjunctive Forms of a
                 {Boolean} Function",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "171--176",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0171",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392736",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schatzoff:1957:MMD,
  author =       "M. Schatzoff and W. B. Harding",
  title =        "A Mathematical Model for Determining the Probabilities
                 of Undetected Errors in Magnetic Tape Systems",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "177--180",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0177",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392737",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schatzhoff:1957:MMD,
  author =       "M. Schatzhoff and W. B. Harding",
  title =        "A Mathematical Model for Determining the Probabilities
                 of Undetected Errors in Magnetic Tape Systems",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "177--??",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seader:1957:SCS,
  author =       "L. D. Seader",
  title =        "A Self-Clocking System for Information Transfer",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "181--184",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0181",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392738",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Walsh:1957:STS,
  author =       "J. L. Walsh",
  title =        "A Symmetrical-Transistor Steering Circuit",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "185--188",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0185",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392739",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{vonHorn:1957:DTR,
  author =       "H. B. {von Horn} and W. Y. Stevens",
  title =        "Determination of Transient Response of a Drift
                 Transistor Using the Diffusion Equation",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "189--191",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0189",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392740",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "192--193",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0192",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392741",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ab,
  author =       "Anonymous",
  title =        "Abstracts",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "192--??",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "194--194",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "194--194",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0194",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392742",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "195--196",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.12.0195",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392743",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ad,
  author =       "Anonymous",
  title =        "The Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "2",
  pages =        "195--??",
  month =        apr,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "197--197",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1957.5392680",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392680",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greenblott:1957:DPM,
  author =       "B. J. Greenblott and J. E. Wallace",
  title =        "Development of the Permissive-Make Relay",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "198--211",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0198",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392681",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greenblatt:1957:DPM,
  author =       "B. J. Greenblatt and J. E. Wallace",
  title =        "Development of the Permissive-Make Relay",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "198--??",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rutz:1957:TCT,
  author =       "R. F. Rutz",
  title =        "Two-Collector Transistor for Binary Full Addition",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "212--222",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0212",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392682",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Landauer:1957:SVC,
  author =       "R. Landauer",
  title =        "Spatial variation of currents and fields due to
                 localized scatterers in metallic conduction",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "223--231",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0223",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "78.0X",
  MRnumber =     "19,805g",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392683",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P.-O. L{\"o}wdin",
}

@Article{Smith:1957:MAM,
  author =       "W. V. Smith",
  title =        "Microwave Amplification by {MASER} Techniques",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "232--238",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0232",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392684",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1957:LHE,
  author =       "P. J. Price",
  title =        "The Linear {Hall} Effect",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "239--248",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0239",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "82.2X",
  MRnumber =     "19,591g",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392685",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P. W. Anderson",
}

@Article{Tasman:1957:LDP,
  author =       "P. Tasman",
  title =        "Literary Data Processing",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "249--256",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0249",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,584a",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392686",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. F. Freiberger",
}

@Article{Walker:1957:EMA,
  author =       "R. M. Walker and D. E. Rosenheim and P. A. Lewis and
                 A. G. Anderson",
  title =        "An Experimental 50-Megacycle Arithmetic Unit",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "257--278",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0257",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392687;
                 http://www.research.ibm.com/journal/rd/013/ibmrd0103H.pdf",
  abstract =     "An experimental 50-megacycle arithmetic unit has been
                 built which performs a repetitive multiplication
                 program and checks the results for errors. The unit
                 uses pulse circuitry which has been developed to
                 perform digital operations at a 50-megacycle
                 pulse-repetition rate. This paper describes the
                 arithmetic system and the circuits which perform the
                 required functions. These circuits include a full
                 binary adder, a phase-locked frequency divider which
                 provides a 3.125-megacycle secondary timing source, a
                 reshaping and retiming circuit using germanium diodes
                 and capacitive storage, a high-speed shift register, a
                 high-speed indicator register, and a binary word
                 generator.\par

                 Various novel features of a digital system operating at
                 these high speeds are described. These include the use
                 of coaxial delay lines for the distribution of signals
                 and as storage elements, and the use of secondary
                 emission tubes in amplifier and multivibrator
                 circuits.\par

                 In a 50-megacycle system the interdependence of the
                 space and time dimensions is marked, and although this
                 introduces problems which are not ordinarily
                 encountered in computing systems, it may be used
                 advantageously to provide features such as the
                 variable-phase clock system used in the arithmetic
                 unit.\par

                 The performance and reliability of the arithmetic unit
                 are discussed as well as the reliability of the
                 components and circuits which make up the system.
                 Although the techniques and circuitry discussed here
                 have been applied only to a relatively simple
                 arithmetic unit, it is felt that they could be useful
                 in a variety of high-speed computing and measurements
                 applications.",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hanson:1957:MMT,
  author =       "J. S. Hanson",
  title =        "Microsectioning: a Metallographic Technique for
                 Semiconductor Devices",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "279--288",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0279",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392688",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "289--290",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0289",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392689",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ae,
  author =       "Anonymous",
  title =        "Abstracts",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "289--??",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "291--291",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "291--291",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0291",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392690",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Af,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "292--292",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.13.0292",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392691",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ag,
  author =       "Anonymous",
  title =        "The Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "3",
  pages =        "292--??",
  month =        jul,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:TCd,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "293--293",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1957.5392693",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392693",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Young:1957:P,
  author =       "D. R. Young",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "293--293",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0293",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392694",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Crowe:1957:TFS,
  author =       "J. W. Crowe",
  title =        "Trapped-Flux Superconducting Memory",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "294--303",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0294",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392695",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Garwin:1957:AOP,
  author =       "R. L. Garwin",
  title =        "An Analysis of the Operation of a
                 Persistent-Supercurrent Memory Cell",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "304--308",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0304",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392696",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Luhn:1957:SAM,
  author =       "Hans Peter Luhn",
  title =        "A statistical approach to mechanized encoding and
                 searching of literary information",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "309--317",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0309",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.0X",
  MRnumber =     "19,1028c",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392697",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "M. L. Minsky",
}

@Article{Drougard:1957:EEF,
  author =       "M. E. Drougard and E. J. Huibregtse",
  title =        "The Effect of an Electric Field on the Transitions of
                 Barium Titanate",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "318--329",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0318",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392698",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Taylor:1957:MHL,
  author =       "R. Taylor",
  title =        "A Mechanical Heart-Lung Apparatus",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "330--340",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0330",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392699",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dunham:1957:FSL,
  author =       "B. Dunham",
  title =        "The formalization of scientific languages. {I}. {The}
                 work of {Woodger} and {Hull}",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "341--348",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0341",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "92.0X",
  MRnumber =     "19,1147j",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392700;
                 http://www.research.ibm.com/journal/rd/014/ibmrd0104G.pdf",
  abstract =     "The extent to which scientific languages can be
                 formalized is an important problem, especially if it is
                 assumed that a theorem-proving machine will deal most
                 effectively with formal systems. In Part I, the
                 axiomatic attempts of Woodger in genetics and of Hull
                 in the theory of rote learning are examined. In Parts
                 II and III, to be published later, the more prominent
                 efforts to formalize physical theory will be considered
                 and a general study will be made of related
                 questions.",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Gorn",
}

@Article{Nicollian:1957:REH,
  author =       "E. H. Nicollian and G. R. Gunther-Mohr and L. R.
                 Weisberg",
  title =        "A Radiant-Energy Heater Using an Ellipsoidal
                 Reflector",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "349--355",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0349",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392701",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smura:1957:BWC,
  author =       "E. J. Smura",
  title =        "A Binary-Weighted Current Decoder",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "356--362",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0356",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392702",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sarley:1957:RIC,
  author =       "J. M. Sarley and R. J. Hendry",
  title =        "Radio-Interference Control as Applied to Business
                 Machines",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "363--372",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0363",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392703",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxauthor =     "J. M. Sarley and R. J. Hendery",
}

@Article{Kurtz:1957:SCF,
  author =       "J. A. Kurtz",
  title =        "Superconducting Connections to Films",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "373--373",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0373",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392704",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "374-",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0374",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392705",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RPI,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "374--??",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "378--378",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0378",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392706",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ah,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "379--380",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.14.0379",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392707",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:Ai,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "379--??",
  month =        oct,
  year =         "1957",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 09:02:59 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1957:CPI,
  author =       "Anonymous",
  title =        "Contents of Previous Issues",
  journal =      j-IBM-JRD,
  volume =       "1",
  number =       "4",
  pages =        "380--380",
  month =        "????",
  year =         "1957",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1957.5392708",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392708",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "1--1",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392653",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392653",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Friedberg:1958:LMI,
  author =       "R. M. Friedberg",
  title =        "A learning machine: {I}",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "2--13",
  month =        jan,
  year =         "1958",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,1085c",
  bibdate =      "Mon Feb 12 08:25:35 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "M. L. Minsky",
}

@Article{Friedberg:1958:LMP,
  author =       "R. M. Friedberg",
  title =        "A Learning Machine: {Part I}",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "2--13",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392654",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Knapp:1958:ESS,
  author =       "C. H. Knapp and E. Shapiro and R. A. Thorpe",
  title =        "An Error-Sampled Sweep-Position Control System",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "14--35",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0014",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392655",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seader:1958:MRH,
  author =       "L. D. Seader",
  title =        "Magnetic-Recording-Head Selection Switch",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "36--42",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0036",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392656",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kogbetliantz:1958:CAUa,
  author =       "E. G. Kogbetliantz",
  title =        "Computation of Arctan {N} for $-\infty < {N} <
                 +\infty$ Using an Electronic Computer",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "43--53",
  month =        jan,
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0043",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.3X",
  MRnumber =     "19,982e",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392657",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "C. B. Haselgrove",
}

@Article{Credle:1958:ELT,
  author =       "A. B. Credle",
  title =        "Effects of Low Temperatures on Transistor
                 Characteristics",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "54--71",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0054",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392658",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lentz:1958:NAS,
  author =       "J. J. Lentz",
  title =        "A New Approach to Small-Computer Programming and
                 Control",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "72--83",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0072",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392659",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "84--85",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0084",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392660",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "86--86",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0086",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392661",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "87--87",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.21.0087",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392662",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:CPI,
  author =       "Anonymous",
  title =        "Contents of Previous Issues",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "1",
  pages =        "88--88",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392663",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392663",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "89--89",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392665",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392665",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hoagland:1958:HRM,
  author =       "A. S. Hoagland",
  title =        "High-Resolution Magnetic Recording Structures",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "90--104",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0090",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392666",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jeenel:1958:PTR,
  author =       "J. Jeenel",
  title =        "Programs as a tool for research in systems
                 organization",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "105--122",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0105",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,1085d",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392667",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Gorn",
}

@Article{Price:1958:SMI,
  author =       "P. J. Price",
  title =        "On the Statistical Mechanics of Impurity Conduction in
                 Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "123--129",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0123",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392668",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Skov:1958:PTD,
  author =       "R. A. Skov",
  title =        "Pulse Time Displacement in High-Density Magnetic
                 Tape",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "130--141",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392669",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dickinson:1958:RIU,
  author =       "W. E. Dickinson and R. M. Walker",
  title =        "Reliability Improvement by the Use of Multiple-Element
                 Switching Circuits",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "142--147",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0142",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392670",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Flehinger:1958:RIT,
  author =       "B. J. Flehinger",
  title =        "Reliability Improvement through Redundancy at Various
                 System Levels",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "148--158",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0148",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392671",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Luhn:1958:ACL,
  author =       "Hans Peter Luhn",
  title =        "The Automatic Creation of Literature Abstracts",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "159--165",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0159",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.0X",
  MRnumber =     "19,888e",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392672",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic abstract generation",
  reviewer =     "C. C. Gotlieb",
}

@Article{Peterson:1958:CA,
  author =       "W. W. Peterson",
  title =        "On Checking an Adder",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "166--168",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0166",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392673",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:1958:NCE,
  author =       "T. C. Chen and R. A. Willoughby",
  title =        "A note on the computation of eigenvalues and vectors
                 of {Hermitean} matrices",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "169--170",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0169",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.00",
  MRnumber =     "20 \#2837",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392674",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P. Henrici",
}

@Article{Anonymous:1958:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "171--172",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0171",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392675",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "173--173",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0173",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392676",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "174--175",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.22.0174",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392677",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:CPFa,
  author =       "Anonymous",
  title =        "Contents of Previous Four Issues",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "2",
  pages =        "276--276",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392678",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392678",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "177--177",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392619",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392619",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Walton:1958:DRP,
  author =       "C. A. Walton",
  title =        "A Direct-Reading Printed-Circuit Commutator for
                 Analog-to-Digital Data Conversion",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "178--192",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0178",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392620",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shafer:1958:PEF,
  author =       "M. W. Shafer",
  title =        "Phase Equilibria in the Ferrite Region of the System
                 Manganese-Iron-Oxygen",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "193--199",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0193",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392621",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1958:PIM,
  author =       "P. J. Price",
  title =        "The Physical Interpretation of Mean Free Path and the
                 Integral Method",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "200--203",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0200",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392622",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Constantine:1958:LSM,
  author =       "G. Constantine",
  title =        "A Load-Sharing Matrix Switch",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "204--211",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0204",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392623",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Triebwasser:1958:SSO,
  author =       "S. Triebwasser",
  title =        "Study of the Second-Order Ferroelectric Transition in
                 Tri-Glycine Sulfate",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "212--217",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0212",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392624",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kogbetliantz:1958:CAUb,
  author =       "E. G. Kogbetliantz",
  title =        "Computation of Arcsin {N} for $0<{N}<1$ Using an
                 Electronic Computer",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "218--222",
  month =        jul,
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0218",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.3X",
  MRnumber =     "19,1197c",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392625",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "C. B. Haselgrove",
}

@Article{Horton:1958:FBA,
  author =       "J. W. Horton and A. G. Anderson",
  title =        "A Full Binary Adder Employing Two Negative-Resistance
                 Diodes",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "223--231",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0223",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392626",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Norden:1958:CFM,
  author =       "P. V. Norden",
  title =        "Curve Fitting for a Model of Applied Research and
                 Development Scheduling",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "232--248",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0232",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392627",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1958:BRL,
  author =       "P. J. Price",
  title =        "The Bipolar Righi-Leduc Effect",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "249--251",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0249",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392628",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kronick:1958:MFP,
  author =       "H. E. Kronick",
  title =        "Magnetic Field Plotter for Superconducting Films",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "252--254",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0252",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392629",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "255--258",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0255",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392630",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "259--259",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0259",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392631",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "260--261",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.23.0260",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392632",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:CPFb,
  author =       "Anonymous",
  title =        "Contents of Previous Four Issues",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "3",
  pages =        "262--263",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392633",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:43 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392633",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:TCd,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "265--265",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392635",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392635",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:BP,
  author =       "Anonymous",
  title =        "Breaker page",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "266--266",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392636",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392636",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:CCS,
  author =       "Anonymous",
  title =        "Conference on Communication of Scientific
                 Information",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "267--267",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1958.5392637",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392637",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wiesner:1958:CSU,
  author =       "J. B. Wiesner",
  title =        "Communication Sciences in a University Environment",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "268--275",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0268",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "20 \#6954",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392638",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Sherman",
  xxtitle =      "Communication science in a university environment",
}

@Article{deGrolier:1958:PSC,
  author =       "E. de Grolier",
  title =        "Problems in Scientific Communication",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "276--281",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0276",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392639",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Good:1958:HMS,
  author =       "I. J. Good",
  title =        "How Much Science Can You Have at Your Fingertips?",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "282--288",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0282",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00 (94.00)",
  MRnumber =     "21 \#449",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392640",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "M. L. Minsky",
}

@Article{Shannon:1958:CSI,
  author =       "C. E. Shannon",
  title =        "Channels with Side Information at the Transmitter",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "289--293",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0289",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "20 \#6951",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392641",
  acknowledgement = ack-nhfb,
  author-dates = "Claude Elwood Shannon (April 30, 1916--February 24,
                 2001)",
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. P. Lloyd",
}

@Article{David:1958:AAR,
  author =       "E. E. David",
  title =        "Artificial Auditory Recognition in Telephony",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "294--309",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0294",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392642",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Astrahan:1958:RLM,
  author =       "M. M. Astrahan",
  title =        "The Role of Large Memories in Scientific
                 Communications",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "310--313",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0310",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392643",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Luhn:1958:BIS,
  author =       "Hans Peter Luhn",
  title =        "A Business Intelligence System",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "314--319",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0314",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.00",
  MRnumber =     "20 \#3745",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/hash.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392644",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic abstract generation; checksum; hashing; KWIC
                 index",
}

@Article{Newell:1958:CPP,
  author =       "Allen Newell and J. C. Shaw and H. A. Simon",
  title =        "Chess-Playing Programs and the Problem of Complexity",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "320--335",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0320",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00 (90.00)",
  MRnumber =     "21 \#446",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392645",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Gorn",
}

@Article{Gelernter:1958:IBP,
  author =       "H. L. Gelernter and N. Rochester",
  title =        "Intelligent Behavior in Problem-Solving Machines",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "336--345",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0336",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00",
  MRnumber =     "23 \#B3114",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392646",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. Simon",
}

@Article{Elias:1958:CPN,
  author =       "P. Elias",
  title =        "Computation in the Presence of Noise",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "346--353",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0346",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "20 \#3043",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392647",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Baxendale:1958:MMI,
  author =       "P. B. Baxendale",
  title =        "Machine-Made Index for Technical {Literature --- An}
                 Experiment",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "354--361",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0354",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392648",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "362--365",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0362",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392649",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "366--366",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0366",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392650",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1958:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "2",
  number =       "4",
  pages =        "367--368",
  month =        "????",
  year =         "1958",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.24.0367",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:45 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392651",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Doyle:1959:AFR,
  author =       "R. H. Doyle and R. A. Meyer and R. P. Pedowitz",
  title =        "Automatic Failure Recovery in a Digital Data
                 Processing System",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "2--12",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392585",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swanson:1959:DAPa,
  author =       "J. A. Swanson",
  title =        "Diffusion Attenuation, {Part I}",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "13--17",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0013",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392586",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swanson:1959:DAPb,
  author =       "J. A. Swanson and K. Y. Sih",
  title =        "Diffusion Attenuation, {Part II}",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "18--24",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0018",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392587",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shapiro:1959:MTE,
  author =       "H. S. Shapiro and D. L. Slotnick",
  title =        "On the Mathematical Theory of Error-Correcting Codes",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "25--34",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0025",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "20 \#5092",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392588",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Strickland:1959:TEC,
  author =       "P. R. Strickland",
  title =        "The Thermal Equivalent Circuit of a Transistor",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "35--45",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0035",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392589",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dunham:1959:MBD,
  author =       "B. Dunham and D. Middleton and J. H. North and J. A.
                 Sliter and J. W. Weltzien",
  title =        "The Multipurpose Bias Device --- {Part II}: {The}
                 Efficiency of Logical Elements",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "46--53",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0046",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392590",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sopka:1959:AAI,
  author =       "J. J. Sopka",
  title =        "An Analysis of Adequate Inventory Levels",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "54--57",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0054",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.00",
  MRnumber =     "21 \#7118",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392591",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. Scarf",
}

@Article{Flehinger:1959:TPL,
  author =       "B. J. Flehinger and P. A. Lewis",
  title =        "Two-Parameter Lifetime Distributions for Reliability
                 Studies of Renewal Processes",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "58--73",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0058",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "62.00",
  MRnumber =     "20 \#6765",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392592",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "Z. W. Birnbaum",
}

@Article{Hopner:1959:EMD,
  author =       "E. Hopner",
  title =        "An Experimental Modulation-Demodulation Scheme for
                 High-Speed Data Transmission",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "74--84",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0074",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392593",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koves:1959:APC,
  author =       "G. Koves",
  title =        "Application of Phase-Contrast Metallography in a
                 Production Laboratory",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "85--92",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0085",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392594",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shevel:1959:ORS,
  author =       "W. Lee Shevel",
  title =        "Observations of Rotational Switching in Ferrites",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "93--95",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0093",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392595",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "96--100",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0096",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392596",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "101--102",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0101",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392597",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "1",
  pages =        "103--104",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.31.0103",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:48 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392598",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hunter:1959:DMA,
  author =       "L. P. Hunter",
  title =        "Direct Measurement of the Angular Dependence of the
                 Imaginary Part of the Atomic Scattering Factor of
                 Germanium",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "106--113",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0106",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392600",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rabin:1959:FAT,
  author =       "M. O. Rabin and D. Scott",
  title =        "Finite Automata and Their Decision Problems",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "114--125",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0114",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93.00 (02.00)",
  MRnumber =     "21 \#2559",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/string-matching.bib;
                 http://www.research.ibm.com/journal/",
  note =         "This paper shows the equivalence of deterministic and
                 nondeterministic finite automata.",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392601",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. McCarthy",
}

@Article{Cole:1959:IFC,
  author =       "H. Cole",
  title =        "Interatomic-Force Constants from a Central-Force Law",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "126--131",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0126",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392602",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Duijvestijn:1959:TSN,
  author =       "A. J. W. Duijvestijn",
  title =        "On the Transition from Superconducting to Normal
                 Phase, Accounting for Latent Heat and Eddy Currents",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "132--139",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0132",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392603",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reeber:1959:GES,
  author =       "M. D. Reeber",
  title =        "Geometric Effects in the Superconducting Transition of
                 Thin Films",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "140--146",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0140",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392604",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kogbetliantz:1959:CSC,
  author =       "E. G. Kogbetliantz",
  title =        "Computation of $\sin{N}$, $\cos{N}$, and ${M}$th Root
                 of ${N}$ Using an Electronic Computer",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "147--152",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0147",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.00",
  MRnumber =     "21 \#964",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "garbo.uwasa.fi:/pc/doc-soft/fpbiblio.txt;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392605",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "B. A. Chartres",
}

@Article{Smith:1959:MRG,
  author =       "W. V. Smith and J. Overmeyer and B. A. Calhoun",
  title =        "Microwave Resonance in Gadolinium-Iron Garnet
                 Crystals",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "153--162",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0153",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392606",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Peterson:1959:CCL,
  author =       "W. W. Peterson and M. O. Rabin",
  title =        "On Codes for Checking Logical Operations",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "163--168",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0163",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "21 \#1918",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392607",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Kochen:1959:EMS,
  author =       "M. Kochen",
  title =        "Extension of {Moore-Shannon} model for relay
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "169--186",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0169",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93.00 (60.00)",
  MRnumber =     "20 \#7597",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392608",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "E. F. Moore",
}

@Article{Sugai:1959:NSL,
  author =       "I. Sugai",
  title =        "Numerical solution of {Laplace}'s equation, given
                 {Cauchy} conditions",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "187--188",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0187",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.00",
  MRnumber =     "21 \#1709",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392609",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "M. A. Hyman",
}

@Article{Rosenberger:1959:CO,
  author =       "G. B. Rosenberger",
  title =        "A Cryogenic Oscillator",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "189--190",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0189",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392610",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1959:NTH,
  author =       "P. J. Price",
  title =        "Noise Theory for Hot Electrons",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "191--193",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0191",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392611",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marcus:1959:DEL,
  author =       "M. P. Marcus",
  title =        "Doubling the Efficiency of the Load-Sharing Matrix
                 Switch",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "194--196",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0194",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392612",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Erdos:1959:EDN,
  author =       "P. Erd{\H{o}}s",
  title =        "Elementary Divisors of Normal Matrices",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "197--197",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0197",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "15.00",
  MRnumber =     "20 \#7034",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392613",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. Schwerdtfeger",
}

@Article{Shepherdson:1959:RTW,
  author =       "J. C. Shepherdson",
  title =        "The Reduction of Two-Way Automata to One-Way
                 Automata",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "198--200",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0198",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93.00 (02.00)",
  MRnumber =     "21 \#2560",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/string-matching.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392614",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. McCarthy",
}

@Article{Anonymous:1959:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "201--204",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0201",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392615",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "205--206",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0205",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392616",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "2",
  pages =        "207--208",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.32.0207",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:50 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392617",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Samuel:1959:SSM,
  author =       "A. L. Samuel",
  title =        "Some Studies in Machine Learning Using the Game of
                 Checkers",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "210--229",
  month =        apr,
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0210",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00 (92.00)",
  MRnumber =     "22 \#2037",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Reprinted in E. A. Feigenbaum and J. Feldman (Eds.)
                 1963, {\em Computers and Thought}, McGraw-Hill, New
                 York",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392560",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ref =          "Q37",
  reviewer =     "S. Gorn",
}

@Article{Rutz:1959:SPE,
  author =       "R. F. Rutz and D. F. Singer",
  title =        "Some Properties of Experimental {1000-Mc}
                 Transistors",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "230--236",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0230",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392561",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gross:1959:GFL,
  author =       "W. A. Gross",
  title =        "A gas film lubrication study. {I}. {Some} theoretical
                 analyses of slider bearings",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "237--255",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0237",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76.00",
  MRnumber =     "21 \#4682",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392562",
  ZMnumber =     "108.39302",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "L. N. Tao",
}

@Article{Michael:1959:GFL,
  author =       "W. A. Michael",
  title =        "A gas film lubrication study. {II}: {Numerical}
                 solution of the {Reynolds} equation for finite slider
                 bearings",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "256--259",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0256",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76.00",
  MRnumber =     "21 \#4683",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392563",
  ZMnumber =     "108.39303",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "L. N. Tao",
}

@Article{Brunner:1959:GFL,
  author =       "R. K. Brunner and J. M. Harker and K. E. Haughton and
                 A. G. Osterlund",
  title =        "A gas film lubrication study. {III}: {Experimental}
                 investigation of pivoted slider bearings",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "260--274",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0260",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76.00",
  MRnumber =     "21 \#4684",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392564",
  ZMnumber =     "108.39401",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "L. N. Tao",
}

@Article{Bennett:1959:ERO,
  author =       "C. A. Bennett",
  title =        "Experiments on The Relation of the Operator to the
                 Control Loop Of an Airborne Digital Computer",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "275--281",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0275",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392565",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Friedberg:1959:LMP,
  author =       "R. M. Friedberg and B. Dunham and J. H. North",
  title =        "A Learning Machine: {Part II}",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "282--287",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0282",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.40",
  MRnumber =     "23 \#B1074",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392566",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "M. L. Minsky",
}

@Article{Blaauw:1959:ICW,
  author =       "G. A. Blaauw",
  title =        "Indexing and Control-Word Techniques",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "288--301",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0288",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00",
  MRnumber =     "21 \#4569",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392567",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "IBM 7030 Stretch",
  reviewer =     "D. E. Muller",
}

@Article{Anonymous:1959:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "302--306",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0302",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392568",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "307--308",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0307",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392569",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "3",
  pages =        "309--310",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.33.0309",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:52 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392570",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:SNA,
  author =       "Anonymous",
  title =        "Some New Aspects of Color Perception",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "312--325",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0312",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392572",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roth:1959:ATM,
  author =       "J. Paul Roth and E. G. Wagner",
  title =        "Algebraic topological methods for the synthesis of
                 switching systems. {III}. {Minimization} of nonsingular
                 {Boolean} trees",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "326--344",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0326",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93.00 (06.00)",
  MRnumber =     "22 \#5513",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392573",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. B. Giever",
}

@Article{Kroll:1959:TFS,
  author =       "N. M. Kroll and I. Palocz",
  title =        "Theory of a Fast-Switching Electron-Beam Frequency
                 Divider",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "345--354",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0345",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392574",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greenstadt:1959:RCP,
  author =       "J. Greenstadt",
  title =        "On the reduction of continuous problems to discrete
                 form",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "355--363",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0355",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.00",
  MRnumber =     "21 \#6705",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392575",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. F. Weinberger",
}

@Article{Price:1959:ET,
  author =       "P. J. Price and J. M. Radcliffe",
  title =        "{Esaki} Tunneling",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "364--371",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0364",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392576",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rutz:1959:MLP,
  author =       "R. F. Rutz",
  title =        "A {3000-Mc} Lumped-Parameter Oscillator Using an
                 {Esaki} Negative-Resistance Diode",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "372--374",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0372",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392577",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dietrich:1959:MMR,
  author =       "W. Dietrich and W. E. Proebster",
  title =        "Millimicrosecond Magnetization Reversal in Thin
                 Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "375--376",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0375",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392578",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Klein:1959:GPT,
  author =       "M. Klein and A. P. Kordalewski",
  title =        "Germanium {PNPN} Thyratron",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "377--379",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392579",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "380--385",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0380",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392580",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "386--387",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0386",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392581",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "388--389",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.34.0388",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392582",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1959:CPF,
  author =       "Anonymous",
  title =        "Contents of Previous Four Issues",
  journal =      j-IBM-JRD,
  volume =       "3",
  number =       "4",
  pages =        "390--390",
  month =        "????",
  year =         "1959",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1959.5392583",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:54 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392583",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wang:1960:TMM,
  author =       "Hao Wang",
  title =        "Toward Mechanical Mathematics",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "2--22",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00 (02.00)",
  MRnumber =     "22 \#4129",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392526",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P. C. Gilmore",
}

@Article{Jones:1960:TTD,
  author =       "R. E. Jones",
  title =        "A Thermodynamic Treatment of Dilute Superconducting
                 Alloys",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "23--27",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0023",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392527",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gilmore:1960:PMQ,
  author =       "P. C. Gilmore",
  title =        "A proof method for quantification theory: its
                 justification and realization",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "28--35",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0028",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00",
  MRnumber =     "23 \#B3113",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392528",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Miranker:1960:WEM,
  author =       "W. L. Miranker",
  title =        "The Wave Equation in a Medium in Motion",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "36--42",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0036",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "73.00 (35.00)",
  MRnumber =     "22 \#1178",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392529",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. W. Craggs",
}

@Article{MacDonald:1960:DMM,
  author =       "J. E. MacDonald",
  title =        "Design methods for maximum minimum-distance
                 error-correcting codes",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "43--57",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0043",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "22 \#1471",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392530",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Melas:1960:NGC,
  author =       "C. M. Melas",
  title =        "A new group of codes for correction of dependent
                 errors in data transmission",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "58--65",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0058",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "22 \#1470",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392531",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Watanabe:1960:ITAa,
  author =       "Satosi Watanabe",
  title =        "Information Theoretical Analysis of Multivariate
                 Correlation",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "66--82",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0066",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00 (62.00)",
  MRnumber =     "22 \#641",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392532",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Kullback",
}

@Article{Anonymous:1960:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "83--88",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0083",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392533",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "89--90",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0089",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392534",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "91--91",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.41.0091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392535",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:CPFa,
  author =       "Anonymous",
  title =        "Contents of Previous Four Issue",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "1",
  pages =        "92--92",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1960.5392536",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:56 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392536",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pugh:1960:F,
  author =       "E. W. Pugh",
  title =        "Foreword",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "94--95",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0094",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392538",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Methfessel:1960:DWT,
  author =       "S. Methfessel and S. Middelhoek and H. Thomas",
  title =        "Domain Walls in Thin Ni-Fe Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "96--106",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0096",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392539",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Erlbach:1960:MMF,
  author =       "E. Erlbach and R. L. Garwin and M. P. Sarachik",
  title =        "Measurement of Magnetic-Field Attenuation By Thin
                 Superconducting Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "107--115",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0107",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392540",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boyd:1960:MAS,
  author =       "E. L. Boyd",
  title =        "Magnetic Anisotropy in Single-Crystal Thin Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "116--129",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0116",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392541",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Caswell:1960:ARG,
  author =       "H. L. Caswell",
  title =        "Analysis of the Residual Gases in Several Types of
                 High-Vacuum Evaporators",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "130--142",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392542",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ham:1960:EPT,
  author =       "F. S. Ham and D. C. Mattis",
  title =        "Electrical Properties of Thin-Film Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "143--151",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0143",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392543",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1960:ACS,
  author =       "P. J. Price",
  title =        "Anisotropic Conduction in Solids Near Surfaces",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "152--157",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0152",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392544",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Friedman:1960:SEC,
  author =       "A. N. Friedman and S. H. Koenig",
  title =        "Size Effects for Conduction in Thin Bismuth Crystals",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "158--162",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0158",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392545",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pugh:1960:AIA,
  author =       "E. W. Pugh and E. L. Boyd and J. F. Freedman",
  title =        "Angle-of-Incidence Anisotropy in Evaporated
                 Nickel-Iron Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "163--172",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0163",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392546",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kahan:1960:STF,
  author =       "G. J. Kahan and R. B. DeLano and A. E. Brennemann and
                 R. T. C. Tsui",
  title =        "Superconducting Tin Films of Low Residual
                 Resistivity",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "173--183",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0173",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392547",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Behrndt:1960:IAM,
  author =       "M. E. Behrndt and R. H. Blumberg and G. R. Giedd",
  title =        "On the Influence of Aggregation on the Magnetic Phase
                 Transition of Evaporated Superconducting Thin Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "184--188",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0184",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392548",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dietrich:1960:NST,
  author =       "W. Dietrich and W. E. Proebster and P. Wolf",
  title =        "Nanosecond Switching in Thin Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "189--196",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0189",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392549",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brennemann:1960:VCC,
  author =       "A. E. Brennemann",
  title =        "The Variation of Cryotron Current Amplification Factor
                 with Temperature [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "197--197",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0197",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392550",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Beckerman:1960:IEE,
  author =       "M. Beckerman and K. H. Behrndt",
  title =        "The Influence of Edge Effects on Domain Structure and
                 Coercive Force of Circular Nickel-Iron Films [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "198--201",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0198",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392551",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kuehler:1960:NEM,
  author =       "J. D. Kuehler",
  title =        "A New Electron Mirror Design [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "202--204",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0202",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392552",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:1960:MCS,
  author =       "R. S. Smith",
  title =        "Measurement of Crystallite Size and Strain of
                 Electroplated Films [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "205--207",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0205",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392553",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Watanabe:1960:ITAb,
  author =       "Satosi Watanabe",
  title =        "Information-Theoretical Aspects of Inductive and
                 Deductive Inference",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "208--231",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0208",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00 (68.00)",
  MRnumber =     "22 \#5503",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392554",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "I. J. Good",
}

@Article{Anonymous:1960:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "232--238",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0232",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392555",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "239--240",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0239",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392556",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "241--243",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.42.0241",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392557",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:CPFb,
  author =       "Anonymous",
  title =        "Contents of Previous Four Issues",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "2",
  pages =        "244--244",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1960.5392558",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:35:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392558",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gunther-Mohr:1960:FPI,
  author =       "G. R. Gunther-Mohr",
  title =        "Foreword to papers in this issue [Vapor Growth]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "247--247",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0247",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392488",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marinace:1960:EVG,
  author =       "J. C. Marinace",
  title =        "Epitaxial Vapor Growth of {Ge} Single Crystals in a
                 Closed-Cycle Process",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "248--255",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0248",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392489",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{ORourke:1960:EPV,
  author =       "M. J. O'Rourke and J. C. Marinace and R. L. Anderson
                 and W. H. White",
  title =        "Electrical Properties of Vapor-Grown {Ge} Junctions",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "256--263",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0256",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392490",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1960:VGV,
  author =       "R. L. Anderson and M. J. O'Rourke",
  title =        "A Vapor-Grown Variable Capacitance Diode",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "264--268",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0264",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392491",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baker:1960:RSI,
  author =       "W. E. Baker and D. M. J. Compton",
  title =        "Radiotracer Studies of the Incorporation of Iodine
                 into Vapor-Grown Ge",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "269--274",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0269",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392492",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baker:1960:IVG,
  author =       "W. E. Baker and D. M. J. Compton",
  title =        "Incorporation of As Into Vapor-Grown Ge",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "275--279",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0275",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392493",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marinace:1960:TDV,
  author =       "J. C. Marinace",
  title =        "Tunnel Diodes by Vapor Growth of {Ge} on {Ge} and on
                 {GaAs} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "280--282",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0280",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392494",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1960:GGA,
  author =       "R. L. Anderson",
  title =        "Germanium-Gallium Arsenide Heterojunctions [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "283--287",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0283",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392495",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wajda:1960:EGS,
  author =       "E. S. Wajda and B. W. Kippenhan and W. H. White",
  title =        "Epitaxial Growth of Silicon [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "288--295",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0288",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392496",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baker:1960:IAV,
  author =       "W. E. Baker and D. M. J. Compton",
  title =        "Incorporation of {Au} into Vapor-Grown {Ge} [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "296--298",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0296",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392497",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Glang:1960:IID,
  author =       "R. Glang and B. W. Kippenhan",
  title =        "Impurity Introduction during Epitaxial Growth of
                 Silicon",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "299--301",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0299",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392498",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ingham:1960:DCE,
  author =       "H. S. Ingham and P. J. McDade",
  title =        "Dislocation Content in Epitaxially Vapor-Grown {Ge}
                 Crystals [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "302--304",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0302",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392499",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swanson:1960:PVL,
  author =       "J. A. Swanson",
  title =        "Physical versus Logical Coupling in Memory Systems",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "305--310",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0305",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00 (68.00)",
  MRnumber =     "22 \#5504",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392500",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "I. J. Good",
}

@Article{Chien:1960:SCN,
  author =       "R. T. Chien",
  title =        "Synthesis of a Communication Net",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "311--320",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0311",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.00",
  MRnumber =     "22 \#13298",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392501",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. T. Tutte",
}

@Article{Mayeda:1960:SSF,
  author =       "W. Mayeda",
  title =        "Synthesis of switching functions by linear graph
                 theory",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "321--328",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0321",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05.00 (93.00)",
  MRnumber =     "22 \#12054",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392502",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "F. Harary",
}

@Article{Meggitt:1960:ECC,
  author =       "J. E. Meggitt",
  title =        "Error correcting codes for correcting bursts of
                 errors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "329--334",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0329",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00",
  MRnumber =     "22 \#13358",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392503",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "F. L. Bauer",
}

@Article{Dickinson:1960:CRS,
  author =       "W. E. Dickinson",
  title =        "A Character-Recognition Study",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "335--348",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0335",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392504",
  ZMnumber =     "091.12402",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Thun:1960:DA,
  author =       "R. E. Thun",
  title =        "On Dimensional Analysis",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "349--356",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0349",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "70.00 (78.00)",
  MRnumber =     "22 \#5151",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392505",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "A. D. Booth",
}

@Article{Partovi:1960:NPU,
  author =       "F. Partovi",
  title =        "Note on Perturbation of a Uniform Magnetic Field by a
                 Cube of Magnetic Material [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "357--358",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0357",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392506",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McCurry:1960:SCL,
  author =       "R. E. McCurry and R. M. Schaffert",
  title =        "Space-Charge-Limited Currents in Resin Films [Letter
                 to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "359--363",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0359",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392507",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Melas:1960:CCD,
  author =       "C. M. Melas",
  title =        "A Cyclic Code for Double Error Correction [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "364--366",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0364",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392508",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "367--373",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0367",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392509",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "374--374",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0374",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392510",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "3",
  pages =        "375--376",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.43.0375",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:01 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392511",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greenberg:1960:FAM,
  author =       "H. J. Greenberg",
  title =        "{Fourier} analysis of the motion of a hydraulically
                 controlled piston",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "378--390",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0378",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76.42",
  MRnumber =     "26 \#989",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392513",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "A. F. Pillow",
}

@Article{Landauer:1960:SWN,
  author =       "R. Landauer",
  title =        "Shock waves in nonlinear transmission lines and their
                 effect on parametric amplification",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "391--401",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0391",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "78.00",
  MRnumber =     "22 \#9087",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392514",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "L. A. Pipes",
}

@Article{Nethercot:1960:STS,
  author =       "A. H. Nethercot",
  title =        "On the Switching Time of Subharmonic Oscillators",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "402--406",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0402",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392515",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dorn:1960:DTC,
  author =       "William S. Dorn",
  title =        "A Duality Theorem for Convex Programs",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "407--413",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0407",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.00",
  MRnumber =     "22 \#5492",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392516",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "D. Gale",
}

@Article{Chien:1960:CON,
  author =       "R. T. Chien",
  title =        "A Class of Optimal Noiseless Load-Sharing Matrix
                 Switches",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "414--417",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0414",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392517",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Constantine:1960:NDL,
  author =       "G. Constantine",
  title =        "New Developments in Load-Sharing Matrix Switches
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "418--422",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0418",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392518",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Carroll:1960:HSC,
  author =       "W. N. Carroll",
  title =        "High-Speed Counter Requiring No Carry Propagation
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "423--425",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0423",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392519",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{OConnell:1960:IBV,
  author =       "J. A. O'Connell and B. Narken",
  title =        "Increasing the Brightness-Voltage Nonlinearity of
                 Electroluminescent Devices [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "426--429",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0426",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392520",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Becker:1960:DCV,
  author =       "C. Becker and C. M. Bruen and R. B. Turner",
  title =        "Determining Component Variation for Gradual Transition
                 between Dissimilar Impedances [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "430--438",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0430",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392521",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "439--448",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0439",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392522",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "449--450",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0449",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392523",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "4",
  pages =        "451--452",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.44.0451",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392524",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tucker:1960:FCP,
  author =       "A. W. Tucker",
  title =        "Foreword [Combinatorial Problems]",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "454--454",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0454",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392457",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fulkerson:1960:TTR,
  author =       "D. R. Fulkerson and H. J. Ryser",
  title =        "Traces, Term Ranks, Widths and Heights",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "455--459",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0455",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "15.45",
  MRnumber =     "27 \#4819",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392458",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. Bays",
}

@Article{Hall:1960:AST,
  author =       "Marshall {Hall, Jr.}",
  title =        "Automorphisms of {Steiner} Triple Systems",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "460--472",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0460",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "50.60",
  MRnumber =     "23 \#A1282",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392459",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. B. Mann",
}

@Article{Riordan:1960:ETH,
  author =       "J. Riordan",
  title =        "The Enumeration of Trees by Height and Diameter",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "473--478",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0473",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05.45",
  MRnumber =     "25 \#3854",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392460",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. A. Dirac",
}

@Article{Miller:1960:MPR,
  author =       "R. E. Miller and J. L. Selfridge",
  title =        "Maximal Paths on Rectangular Boards",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "479--486",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0479",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05.24",
  MRnumber =     "23 \#A1556",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392461",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "B. W. Jones",
}

@Article{Hoffman:1960:ECC,
  author =       "A. J. Hoffman",
  title =        "On the exceptional case in a characterization of the
                 arcs of a complete graph",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "487--496",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0487",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05.65",
  MRnumber =     "25 \#3861",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392462",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. A. Dirac",
}

@Article{Hoffman:1960:MGD,
  author =       "A. J. Hoffman and R. R. Singleton",
  title =        "On {Moore} graphs with diameters $2$ and $3$",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "497--504",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0497",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05.40",
  MRnumber =     "25 \#3857",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392463",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. A. Dirac",
}

@Article{Dantzig:1960:IPS,
  author =       "G. B. Dantzig",
  title =        "Inductive Proof of the Simplex Method",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "505--506",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0505",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.50",
  MRnumber =     "23 \#B1596",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392464",
  ZMnumber =     "129.33905",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tucker:1960:SMG,
  author =       "A. W. Tucker",
  title =        "Solving a Matrix Game by Linear Programming",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "507--517",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0507",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.70",
  MRnumber =     "24 \#B410",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392465",
  ZMnumber =     "114.12405",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. H. Griesmer",
}

@Article{Kuhn:1960:SCL,
  author =       "H. W. Kuhn",
  title =        "Some Combinatorial Lemmas in Topology",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "518--524",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0518",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "54.85",
  MRnumber =     "23 \#A1358",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392466",
  ZMnumber =     "109.15603",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. S. Young",
}

@Article{Moore:1960:MCR,
  author =       "Edward F. Moore",
  title =        "Minimal Complete Relay Decoding Networks",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "525--531",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0525",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "24 \#B453",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392467",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. H. Griesmer",
  xxpages =      "524--531",
}

@Article{Griesmer:1960:BEC,
  author =       "J. H. Griesmer",
  title =        "A Bound for Error-Correcting Codes",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "532--542",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0532",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "23 \#B3081",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392468",
  ZMnumber =     "234.94009",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roth:1960:MBT,
  author =       "J. Paul Roth",
  title =        "Minimization over {Boolean} Trees",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "543--558",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0543",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392469",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roth:1960:PMB,
  author =       "J. Paul Roth",
  title =        "Minimization over {Boolean} trees",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "??",
  pages =        "543--558",
  year =         "1960",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "25 \#4942",
  bibdate =      "Tue Sep 11 16:25:33 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. A. Dirac",
}

@Article{Anonymous:1960:Ae,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "559--560",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.45.0559",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392470",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1960:CPT,
  author =       "Anonymous",
  title =        "Contents of Previous Two Issues",
  journal =      j-IBM-JRD,
  volume =       "4",
  number =       "5",
  pages =        "561--561",
  month =        "????",
  year =         "1960",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1960.5392471",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:06 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392471",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Miranker:1961:PSW,
  author =       "W. L. Miranker",
  title =        "Periodic solutions of the wave equation with a
                 nonlinear interface condition",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "2--24",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "78.00",
  MRnumber =     "22 \#9080",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392473",
  ZMnumber =     "148.08405",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "V. M. Papadopoulos",
}

@Article{Kennedy:1961:TCM,
  author =       "D. P. Kennedy",
  title =        "Theoretical Current Multiplication of a Cylindrical
                 Hook Collector",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "25--32",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0025",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392474",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hellerman:1961:MAC,
  author =       "L. Hellerman and E. J. Skiko",
  title =        "Methods of Analysis of Circuit Transient Performance",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "33--43",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0033",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392475",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Titcomb:1961:ACI,
  author =       "S. C. Titcomb",
  title =        "Analysis of a Constant-Input-Flow Hydraulic System",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "44--55",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0044",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392476",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1961:SSO,
  author =       "P. P. Sorokin and M. J. Stevenson",
  title =        "Solid-State Optical Maser Using Divalent Samarium in
                 Calcium Fluoride [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "56--58",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0056",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392477",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McDermid:1961:MAM,
  author =       "W. L. McDermid and H. E. Petersen",
  title =        "A Magnetic Associative Memory System [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "59--62",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0059",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392478",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1961:AMM,
  author =       "P. J. Price and Yi-Han Kao",
  title =        "Acoustic-Mode Mobilities for {``Split-p--Silicon''}
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "63--64",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0063",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392479",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Keyes:1961:HLI,
  author =       "R. W. Keyes",
  title =        "Hydrogen-like Impurity States in Axially Symmetric
                 Crystals [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "65--66",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0065",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392480",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Foglia:1961:CCS,
  author =       "H. R. Foglia and W. L. McDermid and H. E. Petersen",
  title =        "Card Capacitor --- a Semipermanent, Read Only Memory
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "67--68",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0067",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392481",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chambers:1961:SXR,
  author =       "F. Chambers and M. Okrasinski and H. Cole",
  title =        "Safe {X}-Ray Shutter and Filter System [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "69--70",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0069",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392482",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "71--78",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0071",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392483",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "79--80",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0079",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392484",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "81--82",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.51.0081",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392485",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:CPF,
  author =       "Anonymous",
  title =        "Contents of Previous Five Issues",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "1",
  pages =        "83--84",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1961.5392486",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392486",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{King:1961:TLP,
  author =       "Gilbert W. King",
  title =        "Table Look-up Procedures in Language Processing ---
                 {Part I}: The Raw Text",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "86--92",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0086",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.00 (68.00)",
  MRnumber =     "22 \#12005",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392434",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "A. G. Oettinger",
}

@Article{Hopner:1961:PRD,
  author =       "E. Hopner",
  title =        "Phase Reversal Data Transmission System for Switched
                 and Private Telephone Line Applications",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "93--105",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0093",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392435",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kiseda:1961:MAM,
  author =       "J. R. Kiseda and H. E. Petersen and W. C. Seelbach and
                 M. Teig",
  title =        "A Magnetic Associative Memory",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "106--121",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0106",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392436",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tiersten:1961:AMS,
  author =       "M. Tiersten",
  title =        "Acoustic-Mode Scattering of Holes",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "122--131",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0122",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392437",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boudreau:1961:ABQ,
  author =       "P. E. Boudreau and M. Kac",
  title =        "Analysis of a basic queuing problem arising in
                 computer systems",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "132--140",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0132",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60.00",
  MRnumber =     "22 \#10027",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392438",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. Riordan",
}

@Article{Welch:1961:DDM,
  author =       "P. D. Welch",
  title =        "A Direct Digital Method of Power Spectrum Estimation",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "141--156",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0141",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392439",
  ZMnumber =     "097.33405",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lasher:1961:DSO,
  author =       "G. J. Lasher",
  title =        "The dynamics of a subharmonic oscillator with linear
                 dissipation",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "157--161",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0157",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "70.00",
  MRnumber =     "22 \#12773",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392440",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "S. P. Diliberto",
}

@Article{Anonymous:1961:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "162--169",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0162",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392441",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "170--171",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0170",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392442",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "2",
  pages =        "172--173",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.52.0172",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392443",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rhodes:1961:MFC,
  author =       "W. H. Rhodes and L. A. Russell and F. E. Sakalay and
                 R. M. Whalen",
  title =        "A 0.7-Microsecond Ferrite Core Memory",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "174--182",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0174",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392445",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Landauer:1961:IHG,
  author =       "R. Landauer",
  title =        "Irreversibility and heat generation in the computing
                 process",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "183--191",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0183",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00",
  MRnumber =     "24 \#B885",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392446",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "L. G. Napolitano",
}

@Article{Craft:1961:TLM,
  author =       "J. L. Craft and E. H. Goldman and W. B. Strohm",
  title =        "A table look-up machine for processing of natural
                 languages",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "192--203",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0192",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392447",
  ZMnumber =     "112.08602",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Leibowitz:1961:AMT,
  author =       "M. A. Leibowitz",
  title =        "An approximate method for treating a class of
                 multiqueue problems",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "204--209",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0204",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60.80",
  MRnumber =     "23 \#A1406",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392448",
  ZMnumber =     "117.13502",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. Riordan",
}

@Article{Swanson:1961:NCP,
  author =       "John A. Swanson",
  title =        "Notes on Cumulative Photovoltages",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "210--217",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0210",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392449",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sprokel:1961:URD,
  author =       "G. J. Sprokel",
  title =        "The Use of Radioisotopes to Determine the Chemistry of
                 Solder Flux",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "218--225",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0218",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392450",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Moser:1961:BSD,
  author =       "J. K. Moser",
  title =        "Bistable systems of differential equations with
                 applications to tunnel diode circuits",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "226--240",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0226",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "23 \#B1614",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392451",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. P. LaSalle",
}

@Article{Marcus:1961:MPD,
  author =       "M. P. Marcus",
  title =        "Minimum Polarized Distance Codes",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "241--248",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0241",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392452",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "249--260",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0249",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392453",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "261--262",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0261",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392454",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "3",
  pages =        "263--264",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.53.0263",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392455",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Keyes:1961:ECE,
  author =       "R. W. Keyes",
  title =        "The Electronic Contribution to the Elastic Properties
                 of Germanium",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "266--278",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0266",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392388",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dew-Hughes:1961:DPF,
  author =       "D. Dew-Hughes",
  title =        "Dislocations and Plastic Flow in Germanium",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "279--286",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0279",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392389",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hoagland:1961:HTD,
  author =       "A. S. Hoagland",
  title =        "A High Track-Density Servo-Access System for Magnetic
                 Recording Disk Storage",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "287--296",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0287",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392390",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nowick:1961:LDFa,
  author =       "A. S. Nowick and B. S. Berry",
  title =        "Lognormal Distribution Function for Describing
                 Anelastic and Other Relaxation Processes {I}. Theory
                 and Numerical Computations",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "297--311",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0297",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392391",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nowick:1961:LDFb,
  author =       "A. S. Nowick and B. S. Berry",
  title =        "Lognormal Distribution Function for Describing
                 Anelastic and Other Relaxation Processes {II}. Data
                 Analysis and Applications",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "312--320",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0312",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392392",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fan:1961:SPP,
  author =       "George J. Fan",
  title =        "A Study of the Playback Process of a Magnetic Ring
                 Head",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "321--325",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0321",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392393",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koehler:1961:NHP,
  author =       "H. Koehler and B. Kostyshyn and T. C. Ku",
  title =        "A Note on {Hall} Probe Resolution [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "326--327",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0326",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392394",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yu:1961:CNC,
  author =       "H. N. Yu",
  title =        "The Chargistor, a New Class of Semiconductor Devices
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "328--330",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0328",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392395",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1961:MCA,
  author =       "D. P. Kennedy",
  title =        "{Monte Carlo} Analysis of Transistor Diffusion
                 Techniques [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "331--334",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0331",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392396",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Palermo:1961:NMP,
  author =       "F. P. Palermo",
  title =        "A Network Minimization Problem [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "335--337",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0335",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392397",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "338--348",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0338",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392398",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "349--350",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0349",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392399",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1961:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "5",
  number =       "4",
  pages =        "351--352",
  month =        "????",
  year =         "1961",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.54.0351",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:10:36 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392400",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marcus:1962:FPI,
  author =       "P. M. Marcus",
  title =        "Foreword to papers in this issue [Fundamental Research
                 in Superconductivity]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "2--2",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392402",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:FRS,
  author =       "Anonymous",
  title =        "Fundamental research in superconductivity",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "??",
  pages =        "3--11",
  year =         "1962",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 12:01:15 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "114.22803",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxnote =       "Check pages: overlap with \cite{Bardeen:1962:RPS}.",
}

@Article{Bardeen:1962:RPS,
  author =       "J. Bardeen",
  title =        "Review of the present status of the theory of
                 superconductivity",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "3--11",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0003",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "81.99",
  MRnumber =     "25 \#2856",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392403",
  ZMnumber =     "114.22802",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "B. P. Nigam",
  xxnote =       "Check pages: overlap with
                 \cite{Anonymous:1962:FRS,vonHagenow:1962:IFP}.",
}

@Article{vonHagenow:1962:IFP,
  author =       "K. U. {von Hagenow} and H. Koppe",
  title =        "On the influence of free path on the {Meissner}
                 effect",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "12--13",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0012",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "81.99",
  MRnumber =     "24 \#B1163",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392404",
  ZMnumber =     "114.22804",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxnote =       "Check pages: overlap with \cite{Bardeen:1962:RPS}. ZM
                 has pages 3--11??",
}

@Article{Swihart:1962:SBI,
  author =       "J. C. Swihart",
  title =        "Solutions of the {BCS} integral equation and
                 deviations from the law of corresponding states",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "14--23",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0014",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "81.45 (81.65)",
  MRnumber =     "24 \#B1569",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392405",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. M. Blatt",
}

@Article{Masuda:1962:NSR,
  author =       "Yoshika Masuda",
  title =        "Nuclear Spin Relaxation in Superconducting Cadmium",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "24--26",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0024",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392406",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mendelssohn:1962:EWS,
  author =       "K. Mendelssohn",
  title =        "Experimental Work on Superconductivity",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "27--30",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0027",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392407",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Little:1962:KRM,
  author =       "W. A. Little",
  title =        "The {Kapitza} Resistance of Metals in the Normal and
                 Superconducting States",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "31--33",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0031",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392408",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shapiro:1962:SET,
  author =       "S. Shapiro and P. H. Smith and J. Nicol and J. L.
                 Miles and P. F. Strong",
  title =        "Superconductivity and Electron Tunneling",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "34--43",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0034",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392409",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Douglass:1962:MFD,
  author =       "D. H. Douglass",
  title =        "Magnetic Field Dependence of the Superconducting
                 Energy Gap in {Ginzburg--Landau} Theory with
                 Application to Al",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "44--48",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0044",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392410",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tinkham:1962:DEG,
  author =       "M. Tinkham",
  title =        "Dependence of the Energy Gap in Superconductors on
                 Position and Magnetic Field",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "49--54",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0049",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392411",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ginsberg:1962:FIA,
  author =       "D. M. Ginsberg and J. D. Leslie",
  title =        "Far-Infrared Absorption in a Lead-Thallium
                 Superconducting Alloy",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "55--57",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0055",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392412",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Morse:1962:UAS,
  author =       "R. W. Morse",
  title =        "Ultrasonic Attenuation in Superconductors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "58--62",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0058",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392413",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Goodman:1962:MBS,
  author =       "B. B. Goodman",
  title =        "The Magnetic Behavior of Superconductors of Negative
                 Surface Energy",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "63--67",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0063",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392414",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coles:1962:EEC,
  author =       "B. R. Coles",
  title =        "Effects of Electron Concentration and Mean Free Path
                 on the Superconducting Behavior of Alloys",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "68--70",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0068",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392415",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meissner:1962:SEE,
  author =       "H. Meissner",
  title =        "Surface Energy Effects at the Boundary between a
                 Superconductor and a Normal Conductor",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "71--74",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0071",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392416",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cooper:1962:SET,
  author =       "L. N. Cooper",
  title =        "Some Elementary Theoretical Considerations Concerning
                 Superconductivity of Superimposed Metallic Films",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "75--76",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0075",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392417",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mapother:1962:TCM,
  author =       "D. E. Mapother",
  title =        "Thermodynamic Consistency of Magnetic and Calorimetric
                 Measurements on Superconductors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "77--81",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0077",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392418",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swenson:1962:TPD,
  author =       "C. A. Swenson",
  title =        "The Temperature and Pressure Dependence of Critical
                 Field Curves",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "82--83",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0082",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392419",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andres:1962:MES,
  author =       "K. Andres and J. L. Olsen and H. Rohrer",
  title =        "Mechanical Effects at the Superconducting Transition",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "84--88",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0084",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392420",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Alers:1962:VEM,
  author =       "G. A. Alers and D. L. Waldorf",
  title =        "Variation of the Elastic Moduli at the Superconducting
                 Transition",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "89--93",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0089",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392421",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seraphim:1962:FSO,
  author =       "D. P. Seraphim and P. M. Marcus",
  title =        "First- and Second-Order Stress Effects on the
                 Superconducting Transitions of Tantalum and Tin",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "94--111",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0094",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392422",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chang:1962:TCD,
  author =       "G. K. Chang and R. E. Jones and A. M. Toxen",
  title =        "Thermal Conductivity of Dilute Indium-Mercury
                 Superconducting Alloys",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "112--115",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0112",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392423",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Blaugher:1962:SSI,
  author =       "R. D. Blaugher and A. Taylor and J. K. Hulm",
  title =        "The Superconductivity of Some Intermetallic
                 Compounds",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "116--118",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0116",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392424",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hake:1962:HFS,
  author =       "R. R. Hake and T. G. Berlincourt and D. H. Leslie",
  title =        "High-Field Superconductivity in Some bcc Ti-Mo and
                 Nb-Zr Alloys",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "119--121",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0119",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392425",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{LeBlanc:1962:ART,
  author =       "M. A. R. LeBlanc",
  title =        "Anomalous Resistive Transitions and New Phenomena in
                 Hard Superconductors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "1",
  pages =        "122--125",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.61.0122",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:25 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392426",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Axelrod:1962:SNH,
  author =       "M. S. Axelrod and A. S. Farber and D. E. Rosenheim",
  title =        "Some New High-Speed Tunnel-Diode Logic Circuits",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "158--169",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0158",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392351",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Esaki:1962:CTD,
  author =       "L. Esaki",
  title =        "Characterization of Tunnel Diode Performance in Terms
                 of Device Figure of Merit and Circuit Time Constant",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "170--178",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0170",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392352",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Uttal:1962:SES,
  author =       "W. R. Uttal and L. Cook",
  title =        "Systematics of the Evoked Somatosensory Cortical
                 Potential",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "179--191",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0179",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392353",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schaffert:1962:CTM,
  author =       "R. M. Schaffert",
  title =        "Charge Transport Mechanisms in the Transfer of Latent
                 Electrostatic Images to Dielectric Surfaces",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "192--199",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0192",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392354",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lyons:1962:UTM,
  author =       "R. E. Lyons and W. Vanderkulk",
  title =        "The Use of Triple-Modular Redundancy to Improve
                 Computer Reliability",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "200--209",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0200",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392355",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meggitt:1962:PDP,
  author =       "J. E. Meggitt",
  title =        "Pseudo Division and Pseudo Multiplication Processes",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "210--226",
  month =        apr,
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0210",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392356",
  ZMnumber =     "201.48709",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roth:1962:MBG,
  author =       "J. Paul Roth and R. M. Karp",
  title =        "Minimization Over {Boolean} Graphs",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "227--238",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0227",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "25 \#4969",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392357",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. Riordan",
}

@Article{Dorn:1962:GHR,
  author =       "William S. Dorn",
  title =        "Generalizations of {Horner}'s rule for polynomial
                 evaluation",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "239--245",
  month =        apr,
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0239",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.50",
  MRnumber =     "24 \#B2541",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/elefunt.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392358",
  ZMnumber =     "128.37202",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "D. H. Lehmer",
}

@Article{Schay:1962:AMM,
  author =       "G. {Schay, Jr.}",
  title =        "Approximate Methods for a Multiqueueing Problem",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "246--249",
  month =        apr,
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0246",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60.80",
  MRnumber =     "25 \#626",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392359",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "D. G. Kendall",
}

@Article{Matthias:1962:SF,
  author =       "B. T. Matthias",
  title =        "Superconductivity and Ferromagnetism",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "250--255",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0250",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392360",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Geballe:1962:IEL,
  author =       "T. H. Geballe and B. T. Matthias",
  title =        "Isotope Effects in Low Temperature Superconductors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "256--257",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0256",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392361",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mattis:1962:IFP,
  author =       "D. C. Mattis",
  title =        "On the Influence of Free Path on the {Meissner} Effect
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "258--258",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0258",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392362",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tideman:1962:CAN,
  author =       "M. Tideman",
  title =        "Comment on {``A Network Minimization Problem''}
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "259--259",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0259",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392363",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Francis:1962:TSM,
  author =       "E. E. Francis and T. C. Ku",
  title =        "A Theoretical Solution for the Magnetic Field in the
                 Vicinity of a Recording Head Air Gap [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "260--262",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0260",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392364",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{LeMehaute:1962:ADI,
  author =       "C. {Le Mehaute}",
  title =        "Application of Differential Interferometry with Two
                 Polarized Beams [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "263--267",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0263",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392365",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rado:1962:CPF,
  author =       "T. Rado",
  title =        "Comments on the Presence Function of
                 {Gazal{\'e}} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "268--269",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0268",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392366",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kochen:1962:CPC,
  author =       "M. Kochen and E. Wong",
  title =        "Concerning the Possibility of a Cooperative
                 Information Exchange [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "270--271",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0270",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392367",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "272--284",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0272",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392368",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "284--285",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0284",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392369",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "2",
  pages =        "286--288",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.62.0286",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:28 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392370",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mach:1962:RSP,
  author =       "R. E. Mach and T. L. Gardner",
  title =        "Rectification of Satellite Photography by Digital
                 Techniques",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "290--305",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0290",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392372",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tasini:1962:MIO,
  author =       "B. B. Tasini and S. Winograd",
  title =        "Multiple Input-Output Links in Computer Systems",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "306--328",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0306",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392373",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Barlow:1962:DGL,
  author =       "E. J. Barlow and W. E. Langlois",
  title =        "Diffusion of Gas from a Liquid into an Expanding
                 Bubble",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "329--337",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0329",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392374",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brown:1962:SAS,
  author =       "L. S. Brown",
  title =        "Spin Absorption Spectra",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "338--347",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0338",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392375",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bate:1962:EEP,
  author =       "G. Bate and H. S. Templeton and J. W. Wenner",
  title =        "An Experiment on the Effect of Particle Orientation on
                 Peak Shift in Magnetic Tapes",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "348--352",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0348",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392376",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bonner:1962:APR,
  author =       "R. E. Bonner",
  title =        "A ``Logical Pattern'' Recognition Program",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "353--360",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0353",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:1962:OMC,
  author =       "A. W. Smith and N. Braslau",
  title =        "Optical Mixing of Coherent and Incoherent Light
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "361--362",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0361",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392378",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{MacDonald:1962:FET,
  author =       "R. E. MacDonald and M. J. Vogel and J. W. Brookman",
  title =        "Fluorescence of Europium Tungstate [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "363--364",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0363",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392379",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bernhard:1962:NNR,
  author =       "S. A. Bernhard and W. L. Duda",
  title =        "A Note on the Nature of {RNA} Codes [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "365--367",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0365",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392380",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dietrich:1962:PSP,
  author =       "W. Dietrich",
  title =        "Partial-Switching Processes in Thin Magnetic Films
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "368--371",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0368",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392381",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brock:1962:DOD,
  author =       "G. E. Brock and C. F. Aliotta",
  title =        "Direct Observation of Dislocation Loops in
                 Arsenic-Doped Germanium [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "372--374",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0372",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392382",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nathan:1962:EBM,
  author =       "M. I. Nathan and S. H. Moll",
  title =        "Electron Beam Microanalysis of Germanium Tunnel Diodes
                 [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "375--377",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0375",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392383",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "378--388",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0378",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392384",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "389--390",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0389",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392385",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "3",
  pages =        "391--392",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.63.0391",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392386",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Middelhoek:1962:SRP,
  author =       "S. Middelhoek",
  title =        "Static Reversal Processes in Thin Ni-Fe Films",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "394--406",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0394",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392314",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boudreau:1962:DQP,
  author =       "P. E. Boudreau and J. S. {Griffin, Jr.} and M. Kac",
  title =        "A discrete queueing problem with variable service
                 times",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "407--418",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0407",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60.80",
  MRnumber =     "26 \#4424",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392315",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. Newell",
}

@Article{Chang:1962:ASQ,
  author =       "Hsu Chang",
  title =        "Analysis of Static and Quasidynamic Behavior of
                 Magnetostatically Coupled Thin Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "419--429",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0419",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392316",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Winograd:1962:CLO,
  author =       "S. Winograd",
  title =        "Coding for Logical Operations",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "430--436",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0430",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "26 \#3542",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392317",
  ZMnumber =     "201.52903",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Horton:1962:ESE,
  author =       "J. W. Horton",
  title =        "Experimental Study of Electron-Beam Driven
                 Semiconductor Devices for Use in a Digital Memory",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "437--448",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0437",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392318",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Freedman:1962:RSS,
  author =       "J. F. Freedman",
  title =        "Residual Stress in Single-Crystal Nickel Films",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "449--455",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0449",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392319",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bebb:1962:PMM,
  author =       "H. B. Bebb",
  title =        "A Polarimetric Method of Measuring Magneto-Optic
                 Coefficients",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "456--461",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0456",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392320",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haskell:1962:PCC,
  author =       "J. W. Haskell",
  title =        "Printed Cards for the Card Capacitor Memory [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "462--463",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0462",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392321",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Segmuller:1962:DLS,
  author =       "A. Segmuller",
  title =        "Determination of Lattice Strain and Crystallite Size
                 in Thin Films [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "464--466",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0464",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392322",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mitchell:1962:DOS,
  author =       "W. L. Mitchell and C. Hays and R. E. Swift",
  title =        "Direct Observations of the Substructure Network in
                 Iron [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "467--469",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0467",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392323",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Leibowitz:1962:NSF,
  author =       "M. A. Leibowitz",
  title =        "A Note on Some Fundamental Parameters of Multiqueue
                 Systems [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "470--471",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0470",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392324",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ma:1962:EIA,
  author =       "J. T. S. Ma and P. K. C. Wang",
  title =        "Effect of Initial Air Content on the Dynamics of
                 Bubbles in Liquids [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "472--474",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0472",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392325",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "475--486",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0475",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392326",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "487--489",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0487",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392327",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "490--491",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.64.0490",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392328",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1962:CPT,
  author =       "Anonymous",
  title =        "Contents of previous three issues",
  journal =      j-IBM-JRD,
  volume =       "6",
  number =       "4",
  pages =        "492--492",
  month =        "????",
  year =         "1962",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1962.5392329",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 16:10:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392329",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meggitt:1963:DMP,
  author =       "J. E. Meggitt",
  title =        "Digit-by-digit methods for polynomials",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "??",
  pages =        "237--245",
  year =         "1963",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.50",
  MRnumber =     "27 \#2100",
  bibdate =      "Tue Sep 11 16:25:43 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kamentsky:1963:CAD,
  author =       "L. A. Kamentsky and C. N. Liu",
  title =        "Computer-automated design of multifont print
                 recognition logic",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "2--13",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392331",
  ZMnumber =     "106.11408",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greanias:1963:RHN,
  author =       "E. C. Greanias and P. F. Meagher and R. J. Norman and
                 P. Essinger",
  title =        "The recognition of handwritten numerals by contour
                 analysis",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "14--21",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0014",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392332",
  ZMnumber =     "106.11409",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sierra:1963:IMR,
  author =       "H. M. Sierra",
  title =        "Increased Magnetic Recording Read-back Resolution by
                 Means of a Linear Passive Network",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "22--33",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0022",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392333",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ames:1963:APE,
  author =       "I. Ames and R. L. Christensen",
  title =        "Anomalous Photoelectric Emission from Nickel",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "34--39",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0034",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392334",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hudson:1963:STA,
  author =       "F. J. Hudson",
  title =        "Synthesis of Transfer Admittance Functions Using
                 Active Components",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "40--43",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0040",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392335",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shah:1963:IEO,
  author =       "M. J. Shah and C. M. Hart",
  title =        "Investigations of the Electro-Optical Birefringence of
                 Polydisperse Bentonite Suspensions",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "44--57",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0044",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392336",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lasher:1963:TRD,
  author =       "G. J. Lasher",
  title =        "Threshold Relations and Diffraction Loss for Injection
                 Lasers",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "58--61",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0058",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392337",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Burns:1963:DEG,
  author =       "G. Burns and R. A. Laff and S. E. Blum and F. H. Dill
                 and M. I. Nathan",
  title =        "Directionality Effects of {GaAs} Light-Emitting
                 Diodes: {Part I} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "62--63",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0062",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392338",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Laff:1963:DEG,
  author =       "R. A. Laff and W. P. Dumke and F. H. Dill and G.
                 Burns",
  title =        "Directionality Effects of {GaAs} Light-Emitting
                 Diodes: {Part II} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "63--65",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0063",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392339",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dumke:1963:EMP,
  author =       "W. P. Dumke",
  title =        "Electromagnetic Mode Population in Light-Emitting
                 Junctions [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "66--67",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0066",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392340",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Title:1963:PRS,
  author =       "R. S. Title",
  title =        "Paramagnetic Resonance of the Shallow Acceptors {Zn} and
                 {Cd} in {GaAs} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "68--69",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0068",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392341",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Michel:1963:DAR,
  author =       "A. E. Michel and E. J. Walker and M. I. Nathan",
  title =        "Determination of the Active Region in Light-Emitting
                 {GaAs} Diodes [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "70--71",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0070",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392342",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Burns:1963:RTS,
  author =       "G. Burns and M. I. Nathan",
  title =        "Room-Temperature Stimulated Emission [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "72--73",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0072",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392343",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Howard:1963:COG,
  author =       "W. E. Howard and F. F. Fang and F. H. Dill and M. I.
                 Nathan",
  title =        "{CW} Operation of a {GaAs} Injection Laser",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "74--75",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0074",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392344",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Crook:1963:ESH,
  author =       "M. N. Crook and D. S. Kellogg",
  title =        "Experimental Study of Human Factors for a Handwritten
                 Numeral Reader [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "76--78",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0076",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392345",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:ITPa,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "79--93",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0079",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392346",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "94--96",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0094",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392347",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "97--99",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.71.0097",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392348",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:CPT,
  author =       "Anonymous",
  title =        "Contents of previous three issues",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "1",
  pages =        "100--100",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1963.5392349",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:39:58 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392349",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gorog:1963:SNC,
  author =       "E. Gorog",
  title =        "Some new classes of cyclic codes used for burst-error
                 correction",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "102--111",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0102",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392284",
  ZMnumber =     "282.94011",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Langlois:1963:LLF,
  author =       "W. E. Langlois",
  title =        "The Lightly Loaded Foil Bearing at Zero Angle of
                 Wrap",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "112--116",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0112",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392285",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sato:1963:PTD,
  author =       "Yasuo Sato",
  title =        "Propagation of Torsional Disturbances in a Homogeneous
                 Elastic Sphere",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "117--120",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0117",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392286",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schay:1963:MKA,
  author =       "G. {Schay, Jr.} and N. Raver",
  title =        "A Method for Key-to-Address Transformation",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "121--126",
  month =        apr,
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0121",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392287",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hanan:1963:ACT,
  author =       "M. Hanan and F. P. Palermo",
  title =        "An Application of Coding Theory to a File Address
                 Problem",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "127--129",
  month =        apr,
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0127",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392288",
  acknowledgement = ack-nhfb,
  annote =       "Mathematical statement of direct access problem.
                 Polynomial hashing.",
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kump:1963:MUC,
  author =       "H. J. Kump and T. G. Greene",
  title =        "Magnetization of Uniaxial Cylindrical Thin Films",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "130--134",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392289",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sprokel:1963:LSC,
  author =       "G. J. Sprokel",
  title =        "A Liquid Scintillation Counter Using Anticoincidence
                 Shielding",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "135--145",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0135",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392290",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rudge:1963:FEL,
  author =       "W. E. Rudge and W. E. Harding and W. E. Mutter",
  title =        "Fly's-Eye Lens Technique for Generating Semiconductor
                 Device Fabrication Masks",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "146--150",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0146",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392291",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Melas:1963:NEC,
  author =       "C. M. Melas and E. Gorog",
  title =        "A Note on Extending Certain Codes to Correct Error
                 Bursts in Longer Messages",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "151--152",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0151",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392292",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baumeister:1963:NCF,
  author =       "H. K. Baumeister",
  title =        "Nominal Clearance of the Foil Bearing",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "153--154",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0153",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392293",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stevenson:1963:LWP,
  author =       "M. J. Stevenson and J. D. Axe and J. R. Lankard",
  title =        "Line Widths and Pressure Shifts in Mode Structure of
                 Stimulated Emission from {GaAs} Junctions",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "155--156",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0155",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392294",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Moll:1963:TCJ,
  author =       "J. L. Moll and J. F. Gibbons",
  title =        "Threshold Current for $p$-n Junction Lasers [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "157--159",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0157",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392295",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koves:1963:DOS,
  author =       "G. Koves and J. Pesch",
  title =        "On the Direct Observation of the Substructure Network
                 in Iron [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "160--162",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0160",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392296",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:ITPb,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "163--174",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0163",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392297",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "175--177",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0175",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392298",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "2",
  pages =        "178--180",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.72.0178",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:00 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392299",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buelow:1963:CPM,
  author =       "F. K. Buelow and F. B. Hartman and E. L. Willette and
                 J. J. Zasio",
  title =        "A Circuit Packaging Model for High-Speed Computer
                 Technology",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "182--189",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0182",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392301",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chung:1963:DAR,
  author =       "D. H. Chung and J. A. Palmieri",
  title =        "Design of {ACP} Resistor-Coupled Switching Circuits",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "190--198",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0190",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392302",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Crawford:1963:ITD,
  author =       "D. J. Crawford and W. D. Pricer and J. J. Zasio",
  title =        "An Improved Tunnel Diode Memory System",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "199--206",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0199",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392303",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ashar:1963:TAD,
  author =       "K. G. Ashar and H. N. Ghosh and A. W. Aldridge and L.
                 J. Patterson",
  title =        "Transient Analysis and Device Characterization of
                 {ACP} Circuits",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "207--223",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0207",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392304",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berger:1963:NME,
  author =       "J. M. Berger and Beno{\^\i}t Mandelbrot",
  title =        "A New Model for Error Clustering in Telephone
                 Circuits",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "224--236",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0224",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/bibnet/authors/m/mandelbrot-benoit.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392305",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxtitle =      "A new model for the clustering of errors on telephone
                 circuits",
}

@Article{Meggitt:1963:DDM,
  author =       "J. E. Meggitt",
  title =        "Digit-by-Digit Methods for Polynomials",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "237--245",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0237",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392306",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bernhard:1963:ADA,
  author =       "S. A. Bernhard and D. F. Bradley and W. L. Duda",
  title =        "Automatic Determination of Amino Acid Sequences",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "246--251",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0246",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392307",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bland:1963:DCU,
  author =       "G. F. Bland",
  title =        "Directional Coupling and its Use for Memory Noise
                 Reduction",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "252--256",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0252",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392308",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dodd:1963:SAE,
  author =       "P. D. Dodd",
  title =        "A Simple Active Equivalent to a Lattice Pulse-Slimming
                 Filter [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "257--258",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0257",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392309",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:ITPc,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "259--272",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0259",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392310",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "273--274",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0273",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392311",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "3",
  pages =        "275--276",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.73.0275",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:03 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392312",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gutzwiller:1963:NWP,
  author =       "M. C. Gutzwiller and W. L. Miranker",
  title =        "Nonlinear Wave Propagation in a Transmission Line
                 Loaded with Thin Permalloy Films",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "278--287",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392254",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tu:1963:TMS,
  author =       "Yih-O. Tu and H. Cohen",
  title =        "A Theoretical Model for Separation in the Fluid Jet
                 Amplifier",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "288--296",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0288",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392255",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jeppesen:1963:PLF,
  author =       "R. H. Jeppesen and H. L. Caswell",
  title =        "Prenucleation of Lead Films with Copper, Gold, and
                 Silver",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "297--302",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0297",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392256",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stuiver:1963:ANC,
  author =       "W. Stuiver and R. S. McDuffie",
  title =        "Analysis and Numerical Calculations of the Dynamic
                 Behavior of Plane Pivoted Slider Bearings",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "303--316",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0303",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392257",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Daher:1963:ACM,
  author =       "P. R. Daher",
  title =        "Automatic Correction of Multiple Errors Originating in
                 a Computer Memory",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "317--324",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0317",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392258",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dammann:1963:DDS,
  author =       "J. E. Dammann and E. J. Skiko and E. V. Weber",
  title =        "A Data Display Subsystem",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "325--333",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0325",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392259",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Keyes:1963:NAL,
  author =       "R. W. Keyes",
  title =        "Nonlinear Absorbers of Light",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "334--336",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0334",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392260",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tarnawsky:1963:TTI,
  author =       "G. O. Tarnawsky",
  title =        "Tagging Techniques for Incorporating Microglossaries
                 in an Automatic Dictionary",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "337--339",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0337",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392261",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Warten:1963:ASS,
  author =       "R. M. Warten",
  title =        "Automatic Step-Size Control for {Runge--Kutta}
                 Integration",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "340--341",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0340",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.61",
  MRnumber =     "27 \#6397",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392262",
  ZMnumber =     "133.38301",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. W. Hamming",
}

@Article{Harris:1963:HSP,
  author =       "T. J. Harris",
  title =        "High-Speed Photographs of Laser-Induced Heating",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "342--344",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0342",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392263",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Barrekette:1963:DFS,
  author =       "E. S. Barrekette and H. Freitag",
  title =        "Diffraction by a Finite Sinusoidal Phase Grating",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "345--349",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0345",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392264",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schay:1963:QPA,
  author =       "Gaza {Schay, Jr.}",
  title =        "On a Queueing Problem Arising in Recirculating
                 Memories",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "350--352",
  month =        oct,
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0350",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392265",
  ZMnumber =     "138.11802",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxpages =      "350--353",
}

@Article{Freiman:1963:FRP,
  author =       "C. V. Freiman and R. T. Chien",
  title =        "Further Results in Polynomial Addressing [Letter to
                 the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "353--354",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0353",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392266",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ku:1963:ATS,
  author =       "T. C. Ku",
  title =        "An Amendment to {``A Theoretical Solution for the
                 Magnetic Field in the Vicinity of a Recording Head Air
                 Gap''} [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "355--355",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0355",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392267",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:ITPd,
  author =       "Anonymous",
  title =        "{IBM} Technical Papers Published Recently in Other
                 Journals",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "356--371",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0356",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392268",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "372--373",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0372",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392269",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1963:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "7",
  number =       "4",
  pages =        "374--376",
  month =        "????",
  year =         "1963",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.74.0374",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:40:04 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392270",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Estes:1964:SSS,
  author =       "S. E. Estes and H. R. Kerby and H. D. Maxey and R. M.
                 Walker",
  title =        "Speech Synthesis from Stored Data",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "2--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801B.pdf",
  abstract =     "The synthesis of speech by joining together segments
                 derived from natural speech has not proven to be
                 satisfactory with segments smaller than words,
                 especially because of discontinuities in pitch and
                 formant frequencies at the junctions. It appears that
                 segmentation of the control signals for an analog
                 synthesizer may avoid these difficulties. This paper
                 describes an experimental system to investigate this
                 method. A library of synthesizer control signals
                 corresponding to subword segments of speech is now
                 being developed. The equipment used to generate the
                 library of control signals, as well as that used to
                 synthesize connected speech from the library, is
                 described.\par

                 The synthesizer is a transistorized terminal analog of
                 the cascade type. The synthesizer control signals are
                 originally derived from functions drawn on a
                 transparent plastic belt with opaque tape and scanned
                 by a CRT and photomultiplier. The control signal
                 functions are varied until the speech segment being
                 studied is satisfactory. The resulting control signals
                 corresponding to the speech segment are then
                 automatically digitized and recorded on punched cards
                 for addition to the library. Connected speech may be
                 generated by computer assembly of the synthesizer
                 control signals corresponding to a sequence of speech
                 segments. In the assembly of connected speech from the
                 library segments, pitch and timing may be specified
                 independently of the sequence of segments if desired.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Drangeid:1964:AMF,
  author =       "K. E. Drangeid and R. Sommerhalder and A.
                 Segm{\"u}ller and H. Seitz",
  title =        "Attenuation of a Magnetic Field by a Superconductor",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "13--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801C.pdf",
  abstract =     "Observation of magnetic ac field penetration through
                 superconducting tin films has led to the discovery of a
                 $180^\circ$ phase shift between the magnetic fields on
                 either side of the film under favorable conditions.
                 This result has so far been published only in a short
                 note, and the present paper presents a detailed
                 description of the experimental technique. A more
                 quantitative discussion, with emphasis on the physical
                 aspects of field attenuation in superconductors, will
                 be published in a future paper.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bonner:1964:SCT,
  author =       "R. E. Bonner",
  title =        "On Some Clustering Techniques",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "22--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801D.pdf",
  abstract =     "The problem of organizing a large mass of data occurs
                 frequently in research. Normally, some process of
                 generalization is used to compress the data so that it
                 can be analyzed more easily. A primitive step in this
                 process is the ``clustering'' technique, which involves
                 gathering together similar data into a cluster to
                 permit a significant generalization.\par

                 This paper describes a number of methods which make use
                 of IBM 7090 computer programs to do clustering. A
                 medical research problem is used to illustrate and
                 compare these methods.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Critchlow:1964:VSP,
  author =       "D. L. Critchlow and R. H. Dennard and E. Hopner",
  title =        "A Vestigial-Sideband, Phase-Reversal Data Transmission
                 System",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "33--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801E.pdf",
  abstract =     "A new method of carrier retrieval is described for a
                 suppressed-carrier, vestigial-sideband data
                 transmission system. Tests over voice grade telephone
                 lines indicate that operation at 3000 bits per second
                 (in some cases, 3600 bps) can be obtained reliably over
                 private lines with simple adjustable equalization,
                 whereas fixed compromise equalization will allow speeds
                 up to 2400 bps over a large percentage of lines in the
                 switched network. The possibility of higher speed
                 operation using a multilevel data signal is
                 demonstrated by tests at 6000 and 8000 bps over a
                 carefully equalized private line.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pliskin:1964:NDT,
  author =       "W. A. Pliskin and E. E. Conrad",
  title =        "Nondestructive Determination of Thickness and
                 Refractive Index of Transparent Films",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "43--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801F.pdf",
  abstract =     "A simple nondestructive method of measuring the
                 refractive index and thickness of transparent films on
                 reflective substrates has been developed. The technique
                 involves the use of a microscope equipped with a
                 monochromatic filter on the objective and a stage that
                 can be rotated so that the reflected light is observed
                 at various angles. The film thickness, $d$, is given by
                 $d=[ \Delta N \lambda]/[2\mu (\cos r_2 - \cos r_1)]$,
                 where $\lambda$ is the wavelength of the filtered
                 light, $\mu$ is the refractive index, and $\Delta N$ is
                 the number of fringes observed between the angles of
                 refraction $r_2$ and $r_1$.\par

                 This technique is especially suited for films thicker
                 than one micron. Techniques are also described for
                 obtaining accurate thicknesses of films less than one
                 micron by the combined use of monochromatic filters and
                 an interference pattern chart. These techniques can be
                 used to determine film thicknesses ranging from several
                 hundred angstroms to several microns with accuracies of
                 0.2\% on films thicker than $2\mu$, and accuracies of
                 tens of angstroms on thinner films. Since visual
                 comparisons of color can be used fairly easily for film
                 thickness determinations, the techniques were used to
                 construct a color chart for thermally grown SiO$_2$
                 films up to $1.5\mu$ thick.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bertin:1964:TLR,
  author =       "C. L. Bertin",
  title =        "Transmission-Line Response Using Frequency
                 Techniques",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "52--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801G.pdf",
  abstract =     "Frequency-domain analysis of transmission-line pulse
                 response is presented. A computer program is used to
                 evaluate the response, using subroutines to describe
                 the line characteristics and terminal conditions. The
                 program is applicable to lines of any cross section in
                 which the TEM mode of propagation exists. The line
                 characteristics are obtained from either formula
                 prediction or frequency measurements on small samples.
                 Because of skin effects or complex geometry, these
                 characteristics can be extremely difficult to
                 calculate, and so an experimental procedure is adopted
                 for determining these parameters. The computer-program
                 results are compared to measured values.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kulcke:1964:FDI,
  author =       "W. Kulcke and T. J. Harris and K. Kosanke and E. Max",
  title =        "A Fast, Digital-Indexed Light Deflector",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "64--67",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801H.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wyner:1964:NCB,
  author =       "A. D. Wyner",
  title =        "A Note on a Class of Binary Cyclic Codes Which Correct
                 Solid-Burst Errors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "68--69",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/081/ibmrd0801I.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RPIa,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "70--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "81--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "1",
  pages =        "83--??",
  month =        jan,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Samuel:1964:FIS,
  author =       "Arthur L. Samuel",
  title =        "Foreword: The {IBM System\slash 360}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "86--86",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802B.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Amdahl:1964:AIS,
  author =       "Gene M. Amdahl and Gerrit A. Blaauw and Frederick P.
                 {Brooks, Jr.}",
  title =        "Architecture of the {IBM System\slash 360}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "87--102",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.82.0087",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/mathcw.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/50th/architectures/amdahl.html;
                 http://www.research.ibm.com/journal/rd/082/ibmrd0802C.pdf",
  abstract =     "The architecture of the newly announced IBM System/360
                 features four innovations:\par

                 1. An approach to storage which permits and exploits
                 very large capacities, hierarchies of speeds, read-only
                 storage for microprogram control, flexible storage
                 protection, and simple program relocation.\par

                 2. An input/output system offering new degrees of
                 concurrent operation, compatible channel operation,
                 data rates approaching 5,000,000 characters/second,
                 integrated design of hardware and software, a new
                 low-cost, multiple-channel package sharing main-frame
                 hardware, new provisions for device status information,
                 and a standard channel interface between central
                 processing unit and input/output devices.\par

                 3. A truly general-purpose machine organization
                 offering new supervisor facilities, powerful logical
                 processing operations, and a wide variety of data
                 formats.\par

                 4. Strict upward and downward machine-language
                 compatibility over a line of six models having a
                 performance range factor of 50.\par

                 This paper discusses in detail the objectives of the
                 design and the rationale for the main features of the
                 architecture. Emphasis is given to the problems raised
                 by the need for compatibility among central processing
                 units of various size and by the conflicting demands of
                 commercial, scientific, real-time, and logical
                 information processing. A tabular summary of the
                 architecture is shown in the Appendices.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Davis:1964:SLT,
  author =       "E. M. Davis and W. E. Harding and R. S. Schwartz and
                 J. J. Corning",
  title =        "Solid Logic Technology: Versatile, High-Performance
                 Microelectronics",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "102--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802D.pdf",
  abstract =     "A new microelectronics packaging technique, called
                 Solid Logic Technology (SLT), utilizes silicon planar
                 glass-encapsulated transistors and diodes, and graphic
                 arts techniques for producing high-quality, passive
                 components having tight tolerances. The result is a
                 process permitting the low-cost realization of a
                 variety of versatile, high-performance circuit
                 modules.\par

                 The salient features of SLT are described: the unique
                 form of the semiconductor devices, the module
                 fabrication process, and some performance results. In
                 addition, insight is provided to the range of
                 components that my be fabricated with this technology,
                 i.e., inductors, capacitors and high-power transistors.
                 Examples are shown of specific high-speed, high-density
                 and complex circuit packages.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Carter:1964:DSF,
  author =       "W. E. Carter and H. C. Montgomery and R. J. Preiss and
                 H. J. Reinheimer",
  title =        "Design of Serviceability Features for the {IBM
                 System\slash 360}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "115--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802E.pdf",
  abstract =     "This paper discusses the design of features that are
                 intended to provide the IBM System/360 with a
                 significant improvement in serviceability over that of
                 previous systems. It was decided from the beginning to
                 develop the System/360 as an integrated package of
                 hardware, operational programs, and maintenance
                 procedures.\par

                 The major problems to be solved in gaining this
                 improvement and integration were (a) reducing the
                 maximum duration of service calls; (b) reducing the
                 median duration and mean duration of service calls; and
                 (c) matching a single package of maintenance programs
                 and procedures to a large variety of operational
                 monitor programs and machine models.\par

                 These problems have been attacked by supplementing
                 standard servicing facilities (both hardware and
                 program) with (a) the ability to record automatically
                 the complete, detailed, system environment at the
                 instant of error discovery; (b) the ability to
                 initialize the CPU to any arbitrarily specified state
                 (either ``legal'' or ``illegal''), to advance from this
                 state by a specified number of machine cycles, and to
                 compare the new state with a precomputed result state,
                 much of this using circuits that are independent of
                 those required for program sequencing; (c) a system of
                 programs that can be integrated with the System/360
                 Design Automation to produce automatically the inputs,
                 results, and location analyses that are required to
                 exploit the capabilities described in (b); (d) a family
                 of diagnostic monitor programs that attack directly the
                 problem of matching maintenance procedures to machine
                 models and operational monitor programs; and (e) a
                 facility to retry failing CPU operations at the
                 instruction level in the larger models, in addition to
                 the usual retry at the program-segment level.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Case:1964:SLD,
  author =       "P. W. Case and H. H. Graff and L. E. Griffith and A.
                 R. LeClercq and W. B. Murley and T. M. Spence",
  title =        "Solid Logic Design Automation",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "127--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802F.pdf",
  abstract =     "This paper describes the unique features of a set of
                 IBM 7090 programs which provide design assistance to
                 engineers who use Solid Logic Technology. These
                 programs were applied in the design of the IBM
                 System/360.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gunn:1964:ICI,
  author =       "J. B. Gunn",
  title =        "Instabilities of Current in {III--V} Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "141--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802G.pdf",
  abstract =     "A description is given of a newly discovered
                 phenomenon which is observed when an electric field of
                 a few thousand V cm$^{-1}$ is applied to a homogeneous
                 sample of $n$-type GaAs or InP. Above a well-defined
                 threshold field, a time-dependent decrease in current
                 is observed, which is largely independent of external
                 circuit conditions. In long specimens this decrease is
                 aperiodic, resembling random noise with a bandwidth of
                 $\approx 10^9$ c/sec. In short specimens, coherent
                 oscillations are observed whose period is equal to the
                 transit time of electrons between the ohmic electrodes
                 of the structure. Frequencies over the range of
                 0.5--6.5 Gc/sec have been generated in this way, using
                 experimental techniques which are described.
                 Measurements of the efficiency of dc-to-rf conversion
                 (from 1 to 2\%), and of peak power outputs (up to 0.5
                 W), suggest that the new effect may have useful
                 applications. Some diagnostic experiments are described
                 and the results are discussed in terms of various
                 possible mechanisms. Although the quantitative
                 agreement with theory is poor it is concluded that the
                 current instability may possibly be due to the
                 amplification of lattice optical modes.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Aaslund:1964:ESD,
  author =       "N. R. D. {\AA}slund and B. T. Cronhjort",
  title =        "Evaluation of Spectrochemical Data Using Digital
                 Techniques",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "160--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802H.pdf",
  abstract =     "This paper describes how a digital computer was used
                 in combination with an emission spectrometer to
                 determine chemical compositions of some steels. A
                 mathematical model describing the relations between the
                 composition and the intensities of the spectral lines
                 was derived and experimentally tested. Both overlapping
                 and matrix effects were considered. The computer was
                 also used to calibrate the instrument.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bartkus:1964:ATB,
  author =       "E. A. Bartkus and J. M. Brownlow and W. A. Crapo and
                 R. F. Elfant and K. R. Grebe and O. A. Gutwin",
  title =        "An Approach Towards Batch Fabricated Ferrite Memory
                 Planes",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "170--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802I.pdf",
  abstract =     "This paper describes a technique for the batch
                 fabrication of ferrite memory arrays in which wire,
                 previously coated with a thermoplastic, is formed into
                 two orthogonally disposed sets of parallel wires. These
                 grids are oriented between opposing molds having
                 matched grooves filled with a fluid mixture of ferrite
                 powder and thermosetting resin, in such a manner that
                 one set of parallel wires coincides with the groove
                 axes. After suitable curing this structure is released
                 and heat treated to pyrolyze the organic materials and
                 sinter the ferrite.\par

                 A yield study on 108 memory arrays produced in this
                 manner resulted in a yield of 72.2\% on pulse testing
                 under simulated operating conditions and an over-all
                 process yield of 36.1\%. The paper concludes with a
                 tabulation of electrical characteristics of the arrays
                 and a brief discussion of the applicability of the
                 technology to various modes of operation and its
                 potential for high-speed (250 nsec magnetic cycle time)
                 operation.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1964:STA,
  author =       "P. P. Sorokin and N. Braslau",
  title =        "Some Theoretical Aspects of a Proposed Double Quantum
                 Stimulated Emission Device",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "177--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802J.pdf",
  abstract =     "A double quantum stimulated emission device is
                 proposed and some operating characteristics and
                 relevant systems of materials are discussed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1964:RLS,
  author =       "P. P. Sorokin and J. J. Luzzi and J. R. Lankard and G.
                 D. Pettit",
  title =        "Ruby Laser {$Q$}-Switching Elements Using
                 Phthalocyanine Molecules in Solution",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "182--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802L.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wnuk:1964:CSC,
  author =       "R. C. Wnuk and T. R. Touw and B. Post",
  title =        "The Crystal Structure of {CaPd$_3$O$_4$}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "185--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802L.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Odeh:1964:ETB,
  author =       "F. M. Odeh",
  title =        "An Existence Theorem for the {BCS} Integral Equation",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "187--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802M.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Johnson:1964:ORA,
  author =       "L. R. Johnson and M. H. McAndrew",
  title =        "On Ordered Retrieval from an Associative Memory",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "189--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/082/ibmrd0802N.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RPIb,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "194--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "208--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "2",
  pages =        "210--??",
  month =        apr,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:1964:F,
  author =       "P. J. Price",
  title =        "Foreword",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "214--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Pages 215 to 298 of this issue are the Proceedings 01
                 the conference on The Physics of Semimetals which was
                 held in Pupin Laboratory, Columbia University on
                 January 21, 1964.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cohen:1964:CCB,
  author =       "M. H. Cohen and L. M. Falicov and S. Golin",
  title =        "Crystal Chemistry and Band Structures of the {Group V}
                 Semimetals and the {IV--VI} Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "215--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:1964:EFH,
  author =       "G. E. Smith and G. A. Baraff and J. M. Rowell",
  title =        "The Effective $g$-factor of Holes in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "228--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vuillemin:1964:HFG,
  author =       "J. J. Vuillemin",
  title =        "High Field Galvanomagnetic Effects in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "232--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jain:1964:PRP,
  author =       "A. L. Jain and R. Jaggi",
  title =        "Piezo-Resistance and Piezo-Hall Effect in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "233--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yarnell:1964:PDC,
  author =       "J. L. Yarnell and J. L. Warren and R. G. Wenzel and S.
                 H. Koenig",
  title =        "Phonon Dispersion Curves in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "234--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hall:1964:TPB,
  author =       "J. J. Hall and S. H. Koenig",
  title =        "Transport Properties and Band Structure in Bismuth,
                 Antimony and their Alloys",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "241--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Datars:1964:CRF,
  author =       "W. R. Datars and J. Vanderkooy",
  title =        "Cyclotron Resonance and the {Fermi} Surface of
                 Antimony",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "247--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brown:1964:GTP,
  author =       "D. M. Brown and S. J. Silverman",
  title =        "Growth and Transport Properties of {Bi--Sb} Single
                 Crystal Alloys",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "253--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McClure:1964:EBS,
  author =       "J. W. McClure",
  title =        "Energy Band Structure of Graphite",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "255--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dresselhaus:1964:FSG,
  author =       "M. S. Dresselhaus and J. G. Mavroides",
  title =        "The {Fermi} Surface of Graphite",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "262--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Soule:1964:CFS,
  author =       "D. E. Soule",
  title =        "Change in {Fermi} Surfaces of Graphite by Dilute
                 Acceptor Doping",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "268--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Klein:1964:SMT,
  author =       "C. A. Klein",
  title =        "{STB} Model and Transport Properties of Pyrolytic
                 Graphites",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "274--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Williams:1964:AWP,
  author =       "G. A. Williams and G. E. Smith",
  title =        "{Alfv{\'e}n} Wave Propagation in Bismuth: Quantum
                 Oscillations of the {Fermi} Surface",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "276--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hebel:1964:IRB,
  author =       "L. C. Hebel",
  title =        "Infrared Reflectivity of Bismuth in the Quantum
                 Limit",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "284--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McWhorter:1964:APW,
  author =       "A. L. McWhorter and W. G. May",
  title =        "Acoustic Plasma Waves in Semimetals",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "285--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tosima:1964:ESM,
  author =       "S. Tosima and R. Hirota",
  title =        "Effect of the Self-Magnetic Field on Galvanomagnetic
                 Effects in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "291--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schillinger:1964:NOC,
  author =       "W. Schillinger",
  title =        "Non-Ohmic Conduction in Bismuth",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "295--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greenberg:1964:LNM,
  author =       "H. J. Greenberg and Allan G. Konheim",
  title =        "Linear and nonlinear methods in pattern
                 classification",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "299--307",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "199.22401",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Newman:1964:MCV,
  author =       "E. G. Newman and L. F. Winter",
  title =        "Magnetically Controlled Variable Logic",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "308--317",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "131.15602",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anello:1964:NDM,
  author =       "A. J. Anello and A. C. Ruocchio and W. D. {VanGieson,
                 Jr.}",
  title =        "A New Digital Method of Bit Synchronization Derived
                 from an Analog Theory",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "318--328",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "137.34303",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxauthor =     "A. J. Anello and A. C. Ruocchio and W. D. {Gieson,
                 Jr.}",
}

@Article{Mitchell:1964:SHA,
  author =       "A. H. Mitchell and K. L. Johnson",
  title =        "Simulation of a Hydraulic Actuator",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "329--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fan:1964:NRM,
  author =       "G. J. Y. Fan",
  title =        "A Note on the Resonant Modes and Spatial Coherency of
                 a {Fabry--Perot} Maser Interferometer",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "335--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Garwin:1964:ANT,
  author =       "R. L. Garwin",
  title =        "Analysis of a Nondegenerate Two-Photon Giant-Pulse
                 Laser",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "338--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RPIc,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "341--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "360--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "3",
  pages =        "361--??",
  month =        jul,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Young:1964:SES,
  author =       "D. R. Young and D. P. Seraphim",
  title =        "Surface Effects on Silicon: Introduction",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "366--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Thomas:1964:SCM,
  author =       "J. E. {Thomas, Jr.} and D. R. Young",
  title =        "Space-Charge Model for Surface Potential Shifts in
                 Silicon Passivated with Thin Insulating Layers",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "368--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kerr:1964:SSP,
  author =       "D. R. Kerr and J. S. Logan and P. J. Burkhardt and W.
                 A. Pliskin",
  title =        "Stabilization of {SiO$_2$} Passivation Layers with
                 {P$_2$O$_5$}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "376--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kerr:1964:ETB,
  author =       "D. R. Kerr",
  title =        "Effect of Temperature and Bias on Glass--Silicon
                 Interfaces",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "385--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Castrucci:1964:ECS,
  author =       "P. P. Castrucci and J. S. Logan",
  title =        "Electrode Control of {SiO$_2$} Passivated Planar
                 Junctions",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "394--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seraphim:1964:EPT,
  author =       "D. P. Seraphim and A. E. Brennemann and F. M. d'Heurle
                 and H. L. Friedman",
  title =        "Electrochemical Phenomena in Thin Films of Silicon
                 Dioxide on Silicon",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "400--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fang:1964:CSS,
  author =       "F. Fang and S. Triebwasser",
  title =        "Carrier Surface Scattering in Silicon Inversion
                 Layers",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "410--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cheroff:1964:ELT,
  author =       "G. Cheroff and F. Fang and F. Hochberg",
  title =        "Effect of Low Temperature Annealing on the Surface
                 Conductivity of {Si} in the {Si--SiO$_2$--Al} System",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "416--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lehman:1964:CAE,
  author =       "H. S. Lehman",
  title =        "Chemical and Ambient Effects on Surface Conduction in
                 Passivated Silicon Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "422--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fowler:1964:HMS,
  author =       "A. B. Fowler and F. Fang and F. Hochberg",
  title =        "{Hall} Measurements on Silicon Field Effect Transistor
                 Structures",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "427--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Adler:1964:VSM,
  author =       "E. Adler",
  title =        "Velocity of Sound in a Many-Valley Conductor",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "430--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:1964:DDT,
  author =       "W. T. Chen",
  title =        "Displacement Discontinuity over a Transversely
                 Isotropic Elastic Half-Space",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "435--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Taub:1964:DTD,
  author =       "D. M. Taub and B. W. Kington",
  title =        "The Design of Transformer (Diamond Ring) Read-Only
                 Stores",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "443--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lever:1964:EBS,
  author =       "R. F. Lever",
  title =        "The Equilibrium Behavior of the
                 Silicon--Hydrogen--Chlorine System",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "460--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brayton:1964:SCL,
  author =       "R. K. Brayton",
  title =        "Stability Criteria for Large Networks",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "466--470",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "222.94027",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lasher:1964:MQI,
  author =       "G. J. Lasher and A. B. Fowler",
  title =        "Mutually Quenched Injection Lasers as Bistable
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "471--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "476--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "4",
  pages =        "??--??",
  month =        sep,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1964:SAD,
  author =       "D. P. Kennedy and P. C. Murley and R. R. O'Brien",
  title =        "A Statistical Approach to the Design of Diffused
                 Junction Transistors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "482--495",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/085/ibmrd0805B.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marcus:1964:CCS,
  author =       "P. M. Marcus",
  title =        "Calculation of the Capacitance of a Semiconductor
                 Surface, with Application to Silicon",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "496--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Murphy:1964:DAT,
  author =       "D. W. Murphy and J. R. Turnbull",
  title =        "Design of {ACP} Tunnel-Diode-Coupled Circuits",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "506--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Swalen:1964:CAE,
  author =       "J. D. Swalen and H. M. Gladney",
  title =        "Computer Analysis of Electron Paramagnetic Resonance
                 Spectra",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "515--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Im:1964:GPG,
  author =       "S. S. Im and J. H. Butler and D. A. Chance",
  title =        "Glass-Passivated {GaAs} Chip Tunnel Diode",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "527--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lasher:1964:TLE,
  author =       "G. J. Lasher and W. V. Smith",
  title =        "Thermal Limitations on the Energy of a Single
                 Injection Laser Light Pulse",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "532--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marcus:1964:DMC,
  author =       "M. P. Marcus",
  title =        "Derivation of Maximal Compatibles Using {Boolean}
                 Algebra",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "537--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rutz:1964:NRT,
  author =       "R. F. Rutz",
  title =        "Negative Resistance Tunnel Diodes in Silicon Carbide",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "539--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marinace:1964:HPC,
  author =       "J. C. Marinace",
  title =        "High Power {CW} Operation of {GaAs} Injection Lasers
                 at {77K}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "543--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Braslau:1964:CMO,
  author =       "N. Braslau and J. B. Gunn and J. L. Staples",
  title =        "Continuous Microwave Oscillations of Current in
                 {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "545--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RPId,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "547--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:RIPe,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "563--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1964:Ae,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "8",
  number =       "5",
  pages =        "566--??",
  month =        nov,
  year =         "1964",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Clementi:1965:AIC,
  author =       "E. Clementi",
  title =        "Ab Initio Computations in Atoms and Molecules",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "2--19",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 09 09:41:45 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See supplemental volume \cite{Clementi:1965:TAF}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schreiner:1965:ADC,
  author =       "K. E. Schreiner and H. L. Funk and E. Hopner",
  title =        "Automatic Distortion Correction for Efficient Pulse
                 Transmission",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "20--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hardy:1965:AIF,
  author =       "W. A. Hardy",
  title =        "Active Image Formation in Lasers",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "31--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Elgot:1965:RDG,
  author =       "C. C. Elgot and J. E. Mezei",
  title =        "On relations defined by generalized finite automata",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "47--68",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.40",
  MRnumber =     "35 \#7732",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "135.00704",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "H. D. Modrow",
}

@Article{Price:1965:ASH,
  author =       "P. J. Price",
  title =        "Amplification of Sound by Hot Electrons",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "69--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RPIe,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "71--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RIPf,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "85--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:Af,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "1",
  pages =        "87--??",
  month =        jan,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eichelberger:1965:HDC,
  author =       "E. B. Eichelberger",
  title =        "Hazard Detection in Combinational and Sequential
                 Switching Circuits",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "90--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zweig:1965:CCM,
  author =       "H. J. Zweig and D. P. Gaver",
  title =        "Coincidence Counter Models with Applications to
                 Photographic Detection Theory",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "100--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Barrekette:1965:PBG,
  author =       "E. S. Barrekette and R. L. Christensen",
  title =        "On Plane Blazed Gratings",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "108--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kump:1965:DFU,
  author =       "H. J. Kump",
  title =        "Demagnetization of Flat Uniaxial Thin Films Under Hard
                 Direction Drive",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "118--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hertrich:1965:AMT,
  author =       "F. R. Hertrich",
  title =        "Average Motion Times of Positioners in Random Access
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "124--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fields:1965:STS,
  author =       "D. S. {Fields, Jr.}",
  title =        "Sheet Thermoforming of a Superplastic Alloy",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "134--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Thrasher:1965:NMF,
  author =       "P. M. Thrasher",
  title =        "A New Method for Frequency-Division Multiplexing, and
                 Its Integration with Time-Division Switching",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "137--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{LeMehaute:1965:ESI,
  author =       "C. LeM{\'e}haut{\'e} and E. Rocher",
  title =        "Electrodeposition of Stress-Insensitive {Ni--Fe} and
                 {Ni--Fe--Cu} Magnetic Alloys",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "141--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Middelhoek:1965:PDB,
  author =       "S. Middelhoek",
  title =        "Peculiar Domain Behavior in Thin, Magnetic {Ni--Fe}
                 Double Films",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "147--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RPIf,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "150--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RIPg,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "163--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:Ag,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "2",
  pages =        "165--??",
  month =        mar,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Armstrong:1965:FHT,
  author =       "J. A. Armstrong",
  title =        "{Fresnel} Holograms: Their Imaging Properties and
                 Aberrations",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "171--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/093/ibmrd0903B.pdf",
  abstract =     "A simple and unified treatment is given of the
                 properties of the magnified or demagnified images
                 reconstructed from Fresnel holograms. The resolution
                 attainable in wavefront reconstruction is discussed
                 with particular attention to the aberrations of
                 reconstructed images. Explicit expressions are given
                 for the five primary wave aberrations, viz., spherical
                 aberration, coma, astigmatism, curvature of field, and
                 distortion.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1965:AIA,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "Analysis of the Impurity Atom Distribution Near the
                 Diffusion Mask for a Planar $p$--$n$ Junction",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "179--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Luttmann:1965:SNE,
  author =       "F. W. Luttmann and T. J. Rivlin",
  title =        "Some Numerical Experiments in the Theory of Polynomial
                 Interpolation",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "187--191",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.20",
  MRnumber =     "31 \#4147",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:1965:CCT,
  author =       "W. T. Chen and R. P. Soni",
  title =        "On a Circular Crack in a Transversely Isotropic
                 Elastic Material Under Prescribed Shear Stress",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "192--195",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "73.99",
  MRnumber =     "31 \#6426",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. D. Kroll",
}

@Article{Flatt:1965:CMC,
  author =       "H. P. Flatt",
  title =        "Chain Matrices and the {Crank--Nicolson} Equation",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "196--199",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.68",
  MRnumber =     "31 \#4191",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "K. Rektorys",
}

@Article{Polgar:1965:DSG,
  author =       "P. Polgar and M. M. Roy and T.-H. Yeh",
  title =        "A Drive Scheme for the {GaAs--Si} Light-Activated
                 Switch",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "200--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McLean:1965:MAR,
  author =       "A. D. McLean and M. Yoshimine",
  title =        "Mapping an arbitrary range into $(-1,\,1)$ with a side
                 condition: {Application} to numerical quadratures",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "203--204",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.55",
  MRnumber =     "32 \#6672",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/093/ibmrd0903H.pdf",
  abstract =     "The mapping used is $x = c_1 + c_2(1 + \beta)/(1 -
                 \beta t)$, where points $x$ in the range $(a,b)$ map
                 onto points in the range $(-1,\,1)$ subject to the
                 constraints that $a \rightarrow -1$, $b \rightarrow 1$,
                 and $m \rightarrow 0$. The value $m$ is an arbitrary
                 point in the range $(a,b)$.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Gauss--Legendre integration",
  reviewer =     "P. J. Davis",
}

@Article{Peterson:1965:NTD,
  author =       "R. H. Peterson and R. L. Hoffman",
  title =        "A New Technique for Dynamic Analysis of Acoustical
                 Noise",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "205--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RPIg,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "209--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RIPh,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "219--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:Ah,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "3",
  pages =        "221--??",
  month =        may,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andrews:1965:CDP,
  author =       "M. C. Andrews",
  title =        "On Communications and Data Processing: a Foreword",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "226--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gorog:1965:NAT,
  author =       "E. Gorog",
  title =        "A New Approach to Time-Domain Equalization",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "228--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ullman:1965:DCC,
  author =       "J. D. Ullman",
  title =        "Decoding of Cyclic Codes Using Position Invariant
                 Functions",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "233--240",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "31 \#4651",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "202.50501",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Blasbalg:1965:CPN,
  author =       "H. Blasbalg",
  title =        "A Comparison of Pseudo-Noise and Conventional
                 Modulation for Multiple-Access Satellite
                 Communications",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "241--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Corr:1965:PPN,
  author =       "F. Corr and R. Crutchfield and J. Marchese",
  title =        "A Pulsed Pseudo-Noise {VHF} Radio Set",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "256--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{VanBlerkom:1965:ASD,
  author =       "R. VanBlerkom and R. E. Sears and D. G. Freeman",
  title =        "Analysis and Simulation of a Digital Matched Filter
                 Receiver of Pseudo-Noise Signals",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "264--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abbott:1965:DAT,
  author =       "G. F. Abbott and R. L. Bence and J. A. Ceonzo and J.
                 M. Regan",
  title =        "Design of an Automatic Telephone Intercept Switch",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "274--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roehr:1965:FPI,
  author =       "K. M. Roehr and P. M. Thrasher and D. J. {McAuliffe,
                 Jr.}",
  title =        "Filter Performance in Integrated Switching and
                 Multiplexing",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "282--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chien:1965:DB,
  author =       "R. T. Chien and D. T. Tang",
  title =        "On Definitions of a Burst",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "292--293",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "31 \#5726",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. W. Peterson",
}

@Article{Mattson:1965:TDC,
  author =       "R. L. Mattson and J. E. Dammann",
  title =        "A Technique for Determining and Coding Subclasses in
                 Pattern Recognition Problems",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "294--302",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00",
  MRnumber =     "31 \#4647",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Keyes:1965:TPI,
  author =       "R. W. Keyes",
  title =        "Thermal Problems of the Injection Laser",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "303--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Weiser:1965:PGD,
  author =       "K. Weiser",
  title =        "Properties of {GaAs} Diodes with {P--P$^0$--N}
                 Structures",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "315--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gregor:1965:VPP,
  author =       "L. V. Gregor and P. Balk and F. J. Campagna",
  title =        "Vapor-Phase Polishing of Silicon with {H$_2$--HBr} Gas
                 Mixtures",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "327--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zweig:1965:TDL,
  author =       "H. J. Zweig",
  title =        "Two-Dimensional Laser Deflection Using {Fourier}
                 Optics",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "333--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kehr:1965:FSC,
  author =       "W. D. Kehr",
  title =        "Fatigue Strength of Case Hardened Steel Specimens
                 Containing Through-The-Case Cracks",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "336--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RPIh,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "339--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RIPi,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "351--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:Ai,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "4",
  pages =        "353--??",
  month =        jul,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nowick:1965:HSM,
  author =       "A. S. Nowick and S. R. Mader",
  title =        "A Hard-Sphere Model to Simulate Alloy Thin Films",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "358--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/095/ibmrd0905a6B.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jona:1965:OCS,
  author =       "F. Jona",
  title =        "Observations of ``Clean'' Surfaces of {Si}, {Ge}, and
                 {GaAs} by Low-Energy Electron Diffraction",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "375--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Davidson:1965:SCC,
  author =       "B. Davidson and M. J. Shah",
  title =        "Simulation of the Catalytic Cracking Process for
                 Styrene Production",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "388--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pilkuhn:1965:JHG,
  author =       "M. H. Pilkuhn and H. S. Rupprecht",
  title =        "Junction Heating of {GaAs} Injection Lasers During
                 Continuous Operation",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "400--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cooley:1965:SEW,
  author =       "J. W. Cooley and F. Stern",
  title =        "Solution of the Equation for Wave Propagation in
                 Layered Slabs with Complex Dielectric Constants",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "405--411",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.62",
  MRnumber =     "32 \#1890",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "248.65052",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sagnis:1965:CMM,
  author =       "J. C. {Sagnis, Jr.} and P. E. Stuckert and R. L.
                 Ward",
  title =        "The Chain Magnetic Memory Element",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "412--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Voit:1965:DPL,
  author =       "W. F. {Voit, Jr.}",
  title =        "Digital Pneumatic Logic Using Coded Tapes",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "418--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1965:ECI,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "The Effective Carrier Ionization Rate in a $p$--$n$
                 Junction at Avalanche Breakdown",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "422--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RPIi,
  author =       "Anonymous",
  title =        "Recent Papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "424--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:RIPj,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "436--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1965:Aj,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "5/6",
  pages =        "438--??",
  month =        sep # "\slash " # nov,
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 30 08:50:43 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Clementi:1965:TAF,
  author =       "Enrico Clementi",
  title =        "Tables of Atomic Functions",
  journal =      j-IBM-JRD,
  volume =       "9",
  number =       "Supplement",
  pages =        "(various)",
  year =         "1965",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 09 13:48:54 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "This volume is a supplement to
                 \cite{Clementi:1965:AIC}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Herrick:1966:SPD,
  author =       "C. E. Herrick",
  title =        "Solution of the Partial Differential Equations
                 Describing Photodecomposition in a Light-absorbing
                 Matrix having Light-absorbing Photoproducts",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "2--5",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392099",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1966:CIA,
  author =       "D. P. Kennedy and P. C. Murley",
  title =        "Calculations of Impurity Atom Diffusion Through a
                 Narrow Diffusion Mask Opening",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "6--12",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0006",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392100",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rutz-Philipp:1966:DTH,
  author =       "E. M. Rutz-Philipp",
  title =        "Design Technique for High-Efficiency Frequency
                 Doublers Based on the Manley and Rowe Energy
                 Relations",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "13--25",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0013",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392101",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lever:1966:CIT,
  author =       "R. F. Lever",
  title =        "Computation of Ion Trajectories in the Monopole Mass
                 Spectrometer by Numerical Integration of {Mathieu}'s
                 Equation",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "26--40",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0026",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392102",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anacker:1966:DPS,
  author =       "W. Anacker and G. F. Bland and P. Pleshko and P. E.
                 Stuckert",
  title =        "On the Design and Performance of a Small 60-nsec
                 Destructive Readout Magnetic Film Memory",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "41--50",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0041",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392103",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Giacoletto:1966:MLP,
  author =       "L. J. Giacoletto",
  title =        "On Measures of Logic Performance: Logic Quantum,
                 Factor, and Figure of Merit",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "51--64",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0051",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392104",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{King:1966:SES,
  author =       "J. H. King and C. J. Tunis",
  title =        "Some Experiments in Spoken Word Recognition",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "65--79",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0065",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392105",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dammann:1966:ECD,
  author =       "J. E. Dammann",
  title =        "An Experiment in Cluster Detection [Letter to the
                 Editor]",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "80--88",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0080",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392106",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kump:1966:DLM,
  author =       "H. J. Kump and H. G. Hottenrott and B. I. Bertelsen
                 and P. T. Chang",
  title =        "The Dispersion Locked Memory Mode for Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "89--94",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0089",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392107",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reid:1966:DTR,
  author =       "F. A. Reid",
  title =        "Dynamic Thermal Response and Voltage Feedback in
                 Junction Transistors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "95--97",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0095",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392108",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Langlois:1966:CTM,
  author =       "W. E. Langlois",
  title =        "Conditions for termination of the method of steepest
                 descent after a finite number of iterations",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "98--99",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0098",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.10",
  MRnumber =     "32 \#6642",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392109",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. C. Rheinboldt",
}

@Article{Anonymous:1966:TPIa,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "100--107",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0100",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392110",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPa,
  author =       "Anonymous",
  title =        "Recent Issued Patents Assigned To {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "108--109",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0108",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392111",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "110--112",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.101.0110",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392112",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:CPTa,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "112--112",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392113",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392113",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:ECP,
  author =       "Anonymous",
  title =        "Errata [{A} Comparison of Pseudo-Noise and
                 Conventional Modulation for Multiple-Access Satellite
                 Communications, by {H}. Blasbalg]",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "1",
  pages =        "112--112",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392114",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:31 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392114",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Foster:1966:FBL,
  author =       "L. M. Foster and T. S. Plaskett and J. E.
                 Scardefield",
  title =        "Formation of Built-in Light-emitting Junctions in
                 Solution-grown {GaP} Containing Shallow Donors and
                 Acceptors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "114--121",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0114",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392059",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pilkuhn:1966:GLS,
  author =       "M. H. Pilkuhn and L. M. Foster",
  title =        "{Green} Luminescence from Solution-grown Junctions in
                 {GaP} Containing Shallow Donors and Acceptors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "122--129",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0122",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392060",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ravi:1966:EKT,
  author =       "C. G. Ravi and G. G. Koerber",
  title =        "Effects of a Keeper on Thin Film Magnetic Bits",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "130--134",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392061",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kirkpatrick:1966:PAL,
  author =       "T. I. Kirkpatrick and N. R. Clark",
  title =        "{Pert} as an Aid to Logic Design",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "135--141",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0135",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392062",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haskell:1966:DPC,
  author =       "J. W. Haskell",
  title =        "Design of a Printed Card Capacitor Read-Only Store",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "142--157",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0142",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392063",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rogers:1966:PCP,
  author =       "W. F. Rogers",
  title =        "A Practical Class of Polynomial Codes",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "158--161",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0158",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392064",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1966:SEO,
  author =       "P. P. Sorokin and J. R. Lankard",
  title =        "Stimulated Emission Observed from an Organic Dye,
                 Chloro-aluminum Phthalocyanine",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "162--163",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0162",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392065",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:TPIb,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "164--180",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0164",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392066",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} Patents Assigned to {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "181--182",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0181",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392067",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "2",
  pages =        "183--184",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.102.0183",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:33 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392068",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hasty:1966:ASP,
  author =       "C. E. Hasty and J. F. Potts",
  title =        "Analysis and Synthesis Procedures for {Geneva}
                 Mechanism Design",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "186--197",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0186",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392070",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pliskin:1966:SLP,
  author =       "W. A. Pliskin",
  title =        "Separation of the Linear and Parabolic Terms in the
                 Steam Oxidation of Silicon",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "198--206",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0198",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392071",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ho:1966:TAS,
  author =       "C. Y. Ho",
  title =        "Tensor Analysis of Spatial Mechanisms",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "207--212",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0207",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392072",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1966:ABC,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "Avalanche Breakdown Calculations for a Planar $p$-n
                 Junction",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "213--219",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0213",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392073",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Czaykowski:1966:SFT,
  author =       "G. T. Czaykowski and I. G. Tadjbakhsh and Yih-O. Tu",
  title =        "Stability of Flexible Tapes in Parallel Flow",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "220--224",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0220",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392074",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:1966:INM,
  author =       "A. W. Smith and J. A. Armstrong",
  title =        "Intensity Noise in Multimode {GaAs} Laser Emission",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "225--232",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0225",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392075",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Speliotis:1966:TAS,
  author =       "D. E. Speliotis and J. R. Morrison",
  title =        "A Theoretical Analysis of Saturation Magnetic
                 Recording",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "233--243",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0233",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392076",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Knauft:1966:SNM,
  author =       "G. Knauft and H. Lamparter and W. G. Spruth",
  title =        "Some New Methods for Digital Encoding of Voice Signals
                 and for Voice Code Translation",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "244--254",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0244",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392077",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kump:1966:TRP,
  author =       "H. J. Kump and P. T. Chang",
  title =        "Thermostrictive Recording on Permalloy Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "255--260",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0255",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392078",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:TPP,
  author =       "Anonymous",
  title =        "Technical Published Papers by {IBM} Authors Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "261--271",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0261",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392079",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPc,
  author =       "Anonymous",
  title =        "Recent Issued Patents Assigned to {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "272--273",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0272",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392080",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "274--275",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.103.0274",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392081",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:CPTb,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "276--276",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392082",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392082",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:EA,
  author =       "Anonymous",
  title =        "Errata [Addendum]",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "3",
  pages =        "276--276",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392083",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:35 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392083",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roth:1966:DAF,
  author =       "J. Paul Roth",
  title =        "Diagnosis of Automata Failures: a Calculus and a
                 Method",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "278--291",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.40",
  MRnumber =     "37 \#7221",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392030",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brayton:1966:NAT,
  author =       "R. K. Brayton and F. G. Gustavson and W. Liniger",
  title =        "A numerical analysis of the transient behavior of a
                 transistor circuit",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "292--299",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0292",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392031",
  ZMnumber =     "203.15302",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gunn:1966:PFS,
  author =       "J. B. Gunn",
  title =        "Properties of a Free, Steadily Travelling Electrical
                 Domain in {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "300--309",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0300",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392032",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gunn:1966:EDC,
  author =       "J. B. Gunn",
  title =        "Effect of Domain and Circuit Properties on
                 Oscillations in {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "310--320",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0310",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392033",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Preisinger:1966:REM,
  author =       "M. Preisinger",
  title =        "Resonant Excitation of Magnetostrictive Driven Print
                 Wires for High-Speed Printing",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "321--332",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0321",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392034",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Matick:1966:HSR,
  author =       "R. E. Matick and P. Pleshko and C. Sie and L. M.
                 Terman",
  title =        "A High-Speed Read Only Store Using Thick Magnetic
                 Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "333--342",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0333",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392035",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Johnson:1966:LFP,
  author =       "C. Johnson and R. C. Turnbull",
  title =        "Localized-Field Permanent Magnet Array for the
                 Thick-Film Read Only Store",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "343--345",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0343",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392036",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Habegger:1966:DLW,
  author =       "M. A. Habegger and T. J. Harris and E. Max",
  title =        "Dynamic Laser Wavelength Selection",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "346--350",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0346",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392037",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Middelhoek:1966:DWV,
  author =       "S. Middelhoek",
  title =        "Domain Wall Velocities in Thin Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "351--354",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0351",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392038",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:TPIc,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "355--363",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0355",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392039",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPd,
  author =       "Anonymous",
  title =        "Recent Issued Patents Assigned to {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "364--365",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0364",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392040",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "366--367",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.104.0366",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392041",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:CPTc,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "368--368",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392042",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392042",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:EE,
  author =       "Anonymous",
  title =        "Errata [Erratum]",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "4",
  pages =        "368--368",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1966.5392043",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:37 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392043",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bilous:1966:DMC,
  author =       "O. Bilous and I. Feinberg and J. L. Langdon",
  title =        "Design of Monolithic Circuit Chips",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "370--376",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0370",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392045",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Slonczewski:1966:TDW,
  author =       "J. C. Slonczewski",
  title =        "Theory of Domain-Wall Structure in Multiple Magnetic
                 Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "377--387",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392046",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rosenberg:1966:MHF,
  author =       "A. L. Rosenberg",
  title =        "On Multi-Head Finite Automata",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "388--394",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0388",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.40",
  MRnumber =     "34 \#2371",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392047",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "E. Shamir",
}

@Article{Price:1966:QME,
  author =       "P. J. Price",
  title =        "The quantum mechanical extension of the {Boltzmann}
                 equation",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "395--400",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0395",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392048",
  ZMnumber =     "148.24004",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1966:EPS,
  author =       "P. P. Sorokin and W. H. Culver and E. C. Hammond and
                 J. R. Lankard",
  title =        "End-Pumped Stimulated Emission from a Thiacarbocyanine
                 Dye",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "401--401",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0401",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392049",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roberts:1966:KTT,
  author =       "S. M. Roberts and J. S. Shipman",
  title =        "The {Kantorovich} theorem and two-point boundary value
                 problems",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "402--406",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0402",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.62",
  MRnumber =     "34 \#2198",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392050",
  ZMnumber =     "196.49704",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "G. N. Lance",
}

@Article{Paris:1966:DSI,
  author =       "D. P. Paris",
  title =        "Digital Simulation of Image-Forming Systems",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "407--411",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0407",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392051",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abbott:1966:DMA,
  author =       "T. D. Abbott",
  title =        "Design of a {Moir{\'e}} Fringe Torque Transducer",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "412--415",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0412",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392052",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roehr:1966:INI,
  author =       "K. M. Roehr",
  title =        "Influence of Non-ideal Filters on the Transmission
                 Characteristics of Resonant Transfer Switching
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "416--419",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0416",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392053",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kehr:1966:SAC,
  author =       "W. D. Kehr and H. E. Seese",
  title =        "Surface Attack in Chromium-Iron Alloys",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "420--421",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0420",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392054",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:TPId,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "422--431",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0422",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392055",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPe,
  author =       "Anonymous",
  title =        "Recent Issued Patents Assigned to {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "432--434",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0432",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392056",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Ae,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "5",
  pages =        "435--436",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.105.0435",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:39 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392057",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{vonMunch:1966:GAP,
  author =       "W. von Munch",
  title =        "Gallium Arsenide Planar Technology",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "438--445",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0438",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392003",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Joshi:1966:DID,
  author =       "M. L. Joshi and S. Dash",
  title =        "Dislocation-Induced Deviation of Phosphorus-Diffusion
                 Profiles in Silicon",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "446--454",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0446",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392004",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rothauser:1966:IVA,
  author =       "E. H. Rothauser",
  title =        "The Integrated Vocoder and its Application in Computer
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "455--461",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0455",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392005",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brown:1966:NMH,
  author =       "Rodney D. Brown",
  title =        "New Methods for De Haas-Shubnikov Measurements",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "462--471",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0462",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392006",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Daniel:1966:PEA,
  author =       "James W. Daniel",
  title =        "A partial error analysis for the solution of
                 differential equations in simulation: a look at
                 {Fowler}'s $z$-transform root-locus method",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "472--476",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0472",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392007",
  ZMnumber =     "208.43303",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ahn:1966:SMM,
  author =       "K. Y. Ahn",
  title =        "In-situ Measurements of Magnetic Properties in
                 Vacuum-Deposited Permalloy Films",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "477--483",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0477",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392008",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chang:1966:EBA,
  author =       "L. L. Chang and P. J. Stiles and L. Esaki",
  title =        "Electron Barriers in {Al-Al$_2$O$_3$-SnTe} and
                 {Al-Al$_2$O$_3$-GeTe} Tunnel Junctions",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "484--486",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0484",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392009",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:TPIe,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "487--497",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0487",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392010",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:RIPf,
  author =       "Anonymous",
  title =        "Recent Issued Patents Assigned to {IBM}",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "498--499",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0498",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392011",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1966:Af,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "10",
  number =       "6",
  pages =        "500--500",
  month =        "????",
  year =         "1966",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.106.0500",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:13:41 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392012",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Flynn:1967:ISM,
  author =       "M. J. Flynn and P. R. Low",
  title =        "The {IBM {System\slash} 360} Model 91: Some Remarks on
                 System Development",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "2--7",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392014",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McLean:1967:TLM,
  author =       "A. D. McLean and M. Yoshimine",
  title =        "Tables of Linear Molecule Wavefunctions",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "11",
  pages =        "8 + 223",
  month =        nov,
  year =         "1967",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 09 13:48:49 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "This volume is a supplement to
                 \cite{McLean:1967:CMP}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1967:ISMa,
  author =       "D. W. Anderson and F. J. Sparacio and R. M. Tomasulo",
  title =        "The {IBM System\slash 360 Model 91}: Machine
                 Philosophy and Instruction Handling",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "8--24",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0008",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392015",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tomasulo:1967:EAE,
  author =       "R. M. Tomasulo",
  title =        "An Efficient Algorithm for Exploiting Multiple
                 Arithmetic Units",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "25--33",
  month =        jan,
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0025",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392028",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1967:ISMb,
  author =       "S. F. Anderson and J. G. Earle and R. E. Goldschmidt
                 and D. M. Powers",
  title =        "The {IBM System\slash 360 Model 91}: Floating-point
                 execution unit",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "34--53",
  month =        jan,
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0034",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392016",
  abstract =     "The principal requirement for the Model 91
                 floating-point execution unit was that it be designed
                 to support the instruction-issuing rate of the
                 processor. The chosen solution was to develop separate,
                 instruction-oriented algorithms for the add, multiply,
                 and divide functions. Linked together by the
                 floating-point instruction unit, the multiple execution
                 units provide concurrent instruction execution at the
                 burst rate of one instruction per cycle.",
  acknowledgement = ack-nhfb # "\slash " # ack-nj,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boland:1967:ISM,
  author =       "L. J. Boland and G. D. Granito and A. U. Marcotte and
                 B. U. Messina and J. W. Smith",
  title =        "The {IBM {System\slash} 360} Model 91: Storage
                 System",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "54--68",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0054",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392017",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Langdon:1967:DHS,
  author =       "J. Langdon and E. J. {Van Derveer}",
  title =        "Design of a High-Speed Transistor for the {ASLT}
                 Current Switch",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "69--73",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0069",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392018",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sechler:1967:ACD,
  author =       "R. F. Sechler and A. R. Strube and J. R. Turnbull",
  title =        "{ASLT} Circuit Design",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "74--85",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0074",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392019",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lloyd:1967:AEH,
  author =       "R. H. F. Lloyd",
  title =        "{ASLT}: An Extension of Hybrid Miniaturization
                 Techniques",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "86--92",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0086",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392020",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Middelhoek:1967:RWC,
  author =       "S. Middelhoek and D. Wild",
  title =        "Review of Wall Creeping in Thin Magnetic Films",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "93--105",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0093",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392021",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mehta:1967:RMD,
  author =       "P. K. Mehta and M. J. Shah",
  title =        "A Rapid Method for Determining Compound Composition of
                 Cement Clinker: Application to Closed Loop Kiln
                 Control",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "106--113",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0106",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392022",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schneider:1967:NED,
  author =       "Peter R. Schneider",
  title =        "On the Necessity to Examine {D}-Chains in Diagnostic
                 Test Generation --- An Example [Letter to the Editor]",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "114--114",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0114",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392023",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPIa,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "115--121",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0115",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392024",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRIa,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "122--124",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0122",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392025",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Aa,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "125--127",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.111.0125",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392026",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPTa,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "1",
  pages =        "128--129",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5392027",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:09 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392027",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1967:LPS,
  author =       "P. P. Sorokin and J. R. Lankard and E. C. Hammond and
                 V. L. Moruzzi",
  title =        "Laser-pumped Stimulated Emission from Organic Dyes:
                 Experimental Studies and Analytical Comparisons",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "130--148",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0130",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391973",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:1967:FEO,
  author =       "P. P. Sorokin and J. R. Lankard",
  title =        "Flashlamp Excitation of Organic Dye Lasers: a Short
                 Communication",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "148--148",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0148",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391974",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Werner:1967:NFC,
  author =       "G. E. Werner and R. M. Whalen and N. F. Lockhart and
                 R. C. Flaker",
  title =        "A 110-Nanosecond Ferrite Core Memory",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "153--161",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0153",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391975",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kohn:1967:VHS,
  author =       "G. Kohn and W. Jutzi and Th. Mohr and D. Seitzer",
  title =        "A Very-High-Speed, Nondestructive-Read Magnetic Film
                 Memory",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "162--168",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0162",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391976",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pugh:1967:DAD,
  author =       "E. W. Pugh and V. T. Shahan and W. T. Siegle",
  title =        "Device and Array Design for a 120-Nanosecond Magnetic
                 Film Main Memory",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "169--178",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0169",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391977",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fredriksen:1967:DDP,
  author =       "T. R. Fredriksen",
  title =        "Direct Digital Processor Control of Stepping Motors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "179--188",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0179",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391978",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Edwards:1967:DSA,
  author =       "R. B. Edwards and D. T. Hodges and W. D. Hopkins and
                 D. P. Paris",
  title =        "Digital Simulation Applied to a Photo-Optical System",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "189--194",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0189",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391979",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPIb,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "195--207",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0195",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391980",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRIb,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "208--209",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0208",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391981",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Ab,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "210--212",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0210",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391982",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:SSD,
  author =       "Anonymous",
  title =        "Special Section on Difference Equations [Foreword]",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "213--213",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0213",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391983",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:APD,
  author =       "Anonymous",
  title =        "Authors of the Paprs on Difference Equations",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "214--214",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5391984",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391984",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Courant:1967:PDE,
  author =       "R. Courant and K. Friedrichs and H. Lewy",
  title =        "On the partial difference equations of mathematical
                 physics",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "215--234",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0215",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "39.20 (69.00)",
  MRnumber =     "35 \#4621",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391985",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lax:1967:HDE,
  author =       "Peter D. Lax",
  title =        "Hyperbolic difference equations: a review of the
                 {Courant-Friedrichs-Lewy} paper in the light of recent
                 developments",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "235--238",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0235",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.67",
  MRnumber =     "36 \#2330",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391986",
  ZMnumber =     "233.65051",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "P. Laasonen",
}

@Article{Widlund:1967:DMP,
  author =       "O. B. Widlund",
  title =        "On difference methods for parabolic equations and
                 alternating direction implicit methods for elliptic
                 equations",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "239--243",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0239",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.68",
  MRnumber =     "36 \#7356",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391987",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. H. Bramble",
}

@Article{Parter:1967:EE,
  author =       "S. V. Parter",
  title =        "Elliptic Equations",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "244--247",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.112.0244",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.66",
  MRnumber =     "37 \#1097",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391988",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPTb,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "2",
  pages =        "248--249",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5391989",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:11 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391989",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:1967:MTL,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "On the Mathematical Theory of the Linearly-Graded
                 {P}-{N} Junction",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "252--270",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0252",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391991",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Joshi:1967:PPA,
  author =       "M. L. Joshi and S. Dash",
  title =        "Precipitation of Phosphorus, Arsenic, and Boron in
                 Thin Silicon Foils",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "271--283",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0271",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391992",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Palmer:1967:VDW,
  author =       "W. Palmer and R. A. Willoughby",
  title =        "On the Velocity of a Domain Wall in an Applied
                 Magnetic Field",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "284--290",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0284",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391993",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Geldermans:1967:CCM,
  author =       "P. Geldermans and H. O. Leilich and T. R. Scott",
  title =        "Characteristics of the Chain Magnetic Film Storage
                 Element",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "291--301",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0291",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391994",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abbas:1967:DCC,
  author =       "S. A. Abbas and H. F. Koehler and T. C. Kwei and H. O.
                 Leilich and R. H. Robinson",
  title =        "Design Considerations for the Chain Magnetic Storage
                 Array",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "302--311",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0302",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391995",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Quarles:1967:CMG,
  author =       "D. A. {Quarles, Jr.} and K. Spielberg",
  title =        "A computer model for global study of the general
                 circulation of the atmosphere",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "312--336",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0312",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391996",
  ZMnumber =     "204.25002",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McGroddy:1967:NCI,
  author =       "J. C. McGroddy and M. I. Nathan",
  title =        "A New Current Instability in {N}-type Germanium",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "337--340",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0337",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391997",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPIc,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "341--354",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0341",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391998",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRIc,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "355--356",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0355",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391999",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Ac,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "357--358",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.113.0357",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392000",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPIa,
  author =       "Anonymous",
  title =        "Contents of previous issue",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "3",
  pages =        "359--359",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5392001",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:13 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5392001",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PCP,
  author =       "Anonymous",
  title =        "Preface to Controls Papers",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "360--360",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0360",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391940",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Robbins:1967:GLC,
  author =       "H. M. Robbins",
  title =        "A Generalized Legendre-Clebsch Condition for the
                 Singular Cases of Optimal Control",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "361--372",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0361",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391941",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brown:1967:RCO,
  author =       "K. R. Brown and G. W. Johnson",
  title =        "Rapid Computation of Optimal Trajectories",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "373--382",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0373",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391942",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roberts:1967:SRT,
  author =       "S. M. Roberts and J. S. Shipman",
  title =        "Some Results in Two-Point Boundary Value Problems",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "383--388",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0383",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.62",
  MRnumber =     "35 \#5144",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391943",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Astrom:1967:CCP,
  author =       "K. J. Astrom",
  title =        "Computer Control of a Paper Machine --- an Application
                 of Linear Stochastic Control Theory",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "389--405",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0389",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391944",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dahlin:1967:LIP,
  author =       "E. B. Dahlin",
  title =        "On-Line Identification of Process Dynamics",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "406--426",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0406",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391945",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Budurka:1967:SCO,
  author =       "W. J. Budurka",
  title =        "Sensitivity Constrained Optimal Control Synthesis",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "427--435",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0427",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391946",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chang:1967:STS,
  author =       "A. Chang",
  title =        "Synchronization of Traffic Signals in Grid Networks",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "436--441",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0436",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391947",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gilson:1967:DPS,
  author =       "L. A. Gilson and E. F. Harrold and F. G. Kilmer",
  title =        "Design Principles for Sampled-Data Systems with
                 Application to Attitude Control of a Large, Flexible
                 Booster",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "442--451",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0442",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391948",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stuehler:1967:COM,
  author =       "J. E. Stuehler and R. V. Watkins",
  title =        "A Computer-Operated Manufacturing and Test System",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "452--460",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0452",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391949",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pliskin:1967:PIT,
  author =       "W. A. Pliskin and P. D. Davidse and H. S. Lehman and
                 L. I. Maissel",
  title =        "Properties of Insulating Thin Films Deposited by {RF}
                 Sputtering",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "461--467",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0461",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391950",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mee:1967:MMS,
  author =       "C. D. Mee",
  title =        "The Magnetization Mechanism in Single-Crystal Garnet
                 Slabs Near the Compensation Temperature",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "468--476",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0468",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391951",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPId,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "477--483",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0477",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391952",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRId,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "484--485",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0484",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391953",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Ad,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "486--488",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.114.0486",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391954",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPTc,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "4",
  pages =        "490--491",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5391955",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:15 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391955",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Maling:1967:RCD,
  author =       "G. C. Maling and K. S. Nordby",
  title =        "Reverberation Chamber Determination of the Acoustic
                 Power of Pure-Tone Sources",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "492--501",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0492",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391957",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Myers:1967:EBS,
  author =       "R. A. Myers and R. V. Pole",
  title =        "The Electron Beam Scanlaser: Theoretical and
                 Operational Studies",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "502--510",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0502",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391958",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Delaney:1967:MCP,
  author =       "R. A. Delaney and H. D. Kaiser",
  title =        "Multiple-Curie-Point Capacitor Dielectrics",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "511--519",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0511",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391959",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brennemann:1967:TIT,
  author =       "A. E. Brennemann and A. V. Brown and M. Hatzakis and
                 A. J. Speth and R. F. M. Thornley",
  title =        "Two Interconnection Techniques for Large-Scale Circuit
                 Integration",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "520--526",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0520",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391960",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lin:1967:ETR,
  author =       "Tung-Po Lin",
  title =        "Estimation of Temperature Rise in Electron Beam
                 Heating of Thin Films",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "527--536",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0527",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391961",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fowler:1967:NIT,
  author =       "M. E. Fowler and R. M. Warten",
  title =        "A numerical integration technique for ordinary
                 differential equations with widely separated
                 eigenvalues",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "537--543",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0537",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.61",
  MRnumber =     "35 \#7586",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391962",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "J. W. Daniel",
}

@Article{Rutz-Philipp:1967:PCN,
  author =       "E. M. Rutz-Philipp",
  title =        "Power Conversion in Nonlinear Resistive Elements
                 Related to Interference Phenomena",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "544--552",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0544",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391963",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mills:1967:E,
  author =       "H. D. Mills",
  title =        "On the Equation $i = i_0 [\exp \alpha (v - {R} i) -
                 1]$",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "553--554",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0553",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391964",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Daughton:1967:DWE,
  author =       "J. M. Daughton and G. E. Keefe and K. Y. Ahn and C.-C.
                 Cho",
  title =        "Domain Wall Energy Measurements using Narrow
                 Permalloy Strips",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "555--557",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0555",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391965",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mullick:1967:PSN,
  author =       "S. K. Mullick",
  title =        "Propagation of Signals in Nonlinear Transmission
                 Lines",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "558--562",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0558",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391966",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Flur:1967:MPS,
  author =       "B. L. Flur",
  title =        "On the Magnetic Properties of Sputtered {NiFe} Films",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "563--569",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0563",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391967",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPIe,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journal",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "570--578",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0570",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391968",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRIe,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "579--580",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0579",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391969",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Ae,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "581--582",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.115.0581",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391970",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPIb,
  author =       "Anonymous",
  title =        "Contents of previous issue",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "5",
  pages =        "583--583",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5391971",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:17 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391971",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kolsky:1967:SCA,
  author =       "H. G. Kolsky",
  title =        "Some Computer Aspects of Meteorology",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "584--600",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0584",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391905",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Samuel:1967:SSM,
  author =       "A. L. Samuel",
  title =        "Some Studies in Machine Learning Using the Game of
                 Checkers. {II} --- Recent progress",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "601--617",
  month =        nov,
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0601",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391906",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haughton:1967:SMT,
  author =       "K. E. Haughton",
  title =        "Similar Motion of Two-Degree-of-Freedom Nonlinear
                 Vibrating Systems with Nonsymmetric Springs",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "618--626",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0618",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391907",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sedore:1967:SPA,
  author =       "S. R. Sedore",
  title =        "{SCEPTRE}: a program for automatic network analysis",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "627--637",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0627",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391908",
  ZMnumber =     "189.17103",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Remley:1967:STF,
  author =       "W. R. Remley",
  title =        "Synthesis of Transfer Functions in a Prescribed
                 Frequency Band",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "638--642",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0638",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391909",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boone:1967:ECM,
  author =       "J. W. Boone and H. S. Todd",
  title =        "Exposure Control in a Multi-Stage Photographic
                 System",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "643--647",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0643",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391910",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Standish:1967:TRR,
  author =       "C. J. Standish",
  title =        "Two Remarks on the Reconstruction of Sampled
                 Non-Bandlimited Functions",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "648--649",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0648",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391911",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:TPIf,
  author =       "Anonymous",
  title =        "Technical Papers by {IBM} Authors Published Recently
                 in Other Journals",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "650--661",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0650",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391912",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:PRIf,
  author =       "Anonymous",
  title =        "Patents Recently Issued to {IBM} Inventors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "662--663",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0662",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391913",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:Af,
  author =       "Anonymous",
  title =        "Authors",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "664--664",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.116.0664",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391914",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1967:CPTd,
  author =       "Anonymous",
  title =        "Contents of previous two issues",
  journal =      j-IBM-JRD,
  volume =       "11",
  number =       "6",
  pages =        "666--667",
  month =        "????",
  year =         "1967",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.1967.5391915",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 15:36:19 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5391915",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McLean:1967:CMP,
  author =       "A. D. McLean and M. Yoshimine",
  title =        "Computation of Molecular Properties and Structure",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "206--233",
  month =        nov,
  year =         "1967",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Dec 04 11:38:05 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See supplemental volume \cite{McLean:1967:TLM}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ratajski:1968:FCS,
  author =       "J. M. Ratajski",
  title =        "Force-frequency coefficient of singly rotated
                 vibrating quartz crystals",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "1",
  pages =        "92--9",
  month =        jan,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7760 (Piezoelectricity and electrostriction)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal properties; piezoelectric oscillations;
                 quartz",
}

@Article{Ahn:1968:SMP,
  author =       "K. Y. Ahn and J. F. Freedman",
  title =        "Some magnetic properties of vacuum-deposited coupled
                 films",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "1",
  pages =        "100--109",
  month =        jan,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7570 (Magnetic films and multilayers)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "magnetic thin films",
}

@Article{Gregor:1968:PDF,
  author =       "L. V. Gregor",
  title =        "Polymer dielectric films",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "2",
  pages =        "140--162",
  month =        mar,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7360 (Electronic properties of thin films); B2800
                 (Dielectric materials and devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "dielectric properties of solids; polymers; thin
                 films",
}

@Article{Tuel:1968:CAS,
  author =       "W. G. {Tuel, Jr.}",
  title =        "Computer algorithm for spectral factorization of
                 rational matrices",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "??",
  pages =        "163--170",
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 12:01:15 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "155.48704",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ghosh:1968:AFG,
  author =       "S. P. Ghosh and C. T. Abraham",
  title =        "Application of finite geometry in file organization
                 for records with multiple-valued attributes",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "2",
  pages =        "180--187",
  month =        mar,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 06 20:57:46 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dowley:1968:SLA,
  author =       "M. W. Dowley and W. L. Peticolas",
  title =        "The study of laser-induced absorption of a secondary
                 light beam in molecular liquids and solutions",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "2",
  pages =        "188--191",
  month =        mar,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A3000 (Atomic and molecular physics); A7820 (Optical
                 properties of bulk materials)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "laser beam effects; light absorption; optical
                 properties of; organic compounds; substances",
}

@Article{McLean:1968:CMP,
  author =       "A. D. McLean and M. Yoshimine",
  title =        "Computation of Molecular Properties and Structure",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "3",
  pages =        "206--233",
  month =        may,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650 (Data handling and computation); A3120 (Specific
                 calculations and results for atoms and molecules)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complete computer programs; molecular electronic
                 structure",
}

@Article{Makous:1968:ELH,
  author =       "W. L. Makous and J. D. Gould",
  title =        "Effects of lasers on the human eye",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "3",
  pages =        "234--211",
  month =        may,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4260 (Laser systems and laser beam applications);
                 A8732 (Physiological optics, vision); A8750E
                 (Bio-optics (effects of microwaves, light, laser and
                 other electromagnetic waves))",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "biological effects of radiation; eye; laser beam
                 effects",
}

@Article{Kennedy:1968:TDM,
  author =       "D. P. Kennedy and P. C. Murley",
  title =        "A two-dimensional mathematical analysis of the
                 diffused semiconductor resistor",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "??",
  pages =        "242--250",
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "212.49001",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hennis:1968:IOP,
  author =       "R. B. Hennis",
  title =        "The {IBM 1975} optical page reader. {I}: System
                 design",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "5",
  pages =        "346--353",
  month =        sep,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "character recognition equipment",
}

@Article{Bartz:1968:IOP,
  author =       "M. R. Bartz",
  title =        "The {IBM 1975} optical page reader. {II}: Video
                 thresholding system",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "5",
  pages =        "354--363",
  month =        sep,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "character recognition equipment",
}

@Article{Andrews:1968:IOP,
  author =       "D. R. Andrews and A. J. Atrubin and K. C. Hu",
  title =        "The {IBM 1975} optical page reader. {III}: Recognition
                 logic development",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "5",
  pages =        "364--371",
  month =        sep,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "character recognition equipment",
}

@Article{Brown:1968:TCM,
  author =       "C. J. Brown and J. T. Ma",
  title =        "Time-optimal control of a moving-coil linear
                 actuator",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "5",
  pages =        "372--379",
  month =        sep,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1330 (Optimal control); C3260 (Actuating and final
                 control devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "actuators; optimal control",
}

@Article{Kennedy:1968:MIA,
  author =       "D. P. Kennedy and P. C. Murley and W. Kleinfelder",
  title =        "On the measurement of impurity atom distributions in
                 silicon by the differential capacitance technique",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "5",
  pages =        "399--409",
  month =        sep,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280C (Conductivity of
                 elemental semiconductors); B2550 (Semiconductor device
                 technology); A6170W (Impurity concentration,
                 distribution, and gradients)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal impurities; elemental semiconductors;
                 measurement; semiconductor materials; silicon",
}

@Article{Oldham:1968:EDC,
  author =       "I. B. Oldham and R. T. Chien and D. T. Tang",
  title =        "Error detection and correction in a photo-digital
                 storage system",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "422--430",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320Z (Other digital storage)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "digital storage",
}

@Article{Brayton:1968:SSC,
  author =       "R. K. Brayton",
  title =        "Small-signal stability criterion for electrical
                 networks containing lossless transmission lines",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "431--440",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1150D (Lumped linear networks)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "lumped parameter networks; transmission line theory",
}

@Article{Ku:1968:CLD,
  author =       "T. C. Ku and J. H. Ramsey and W. C. Clinton",
  title =        "Calculation of liquid droplet profiles from
                 closed-form solution of {Young-Laplace} equation",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "441--447",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "187.49401",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755K (Multiphase flows)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "drops",
}

@Article{Segmuller:1968:XDT,
  author =       "A. Segmuller",
  title =        "{X}-ray diffraction topography of germanium wafers",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "448--457",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170 (Defects in crystals); A6480G (Microstructure)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal defects; crystal microstructure; elemental;
                 germanium; semiconductors; X-ray diffraction",
}

@Article{Morehead:1968:PJZ,
  author =       "F. F. Morehead and B. L. Crowder",
  title =        "Photo-$n$--$p$ junctions in {ZnTe}",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "458--464",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7960 (Photoemission and photoelectron spectra
                 (condensed matter)); B4260 (Electroluminescent
                 devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "junctions; light sources; photoemissive devices;
                 semiconductor; zinc compounds",
}

@Article{Strong:1968:AGR,
  author =       "H. R. Strong",
  title =        "Algebraically generalized recursive function theory",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "465--475",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "02.70",
  MRnumber =     "41 \#6689",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "185.01903",
  acknowledgement = ack-nhfb,
  classcodes =   "B0210 (Algebra); C1110 (Algebra)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebra; set theory",
}

@Article{Dhaka:1968:DFS,
  author =       "V. A. Dhaka",
  title =        "Design and fabrication of subnanosecond current switch
                 and transistors",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "476--482",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices); B2570
                 (Semiconductor integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "monolithic integrated circuits; switches;
                 transistors",
}

@Article{Gereth:1968:NAE,
  author =       "R. Gereth and M. E. Cowher",
  title =        "New annealing effects on the bulk corrosion potential
                 of germanium",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "6",
  pages =        "483--485",
  month =        nov,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "corrosion; heat treatment; semiconductor materials",
}

@Article{Pliskin:1968:RTC,
  author =       "W. A. Pliskin and R. A. Wesson",
  title =        "Reflectivity thickness corrections for silicon dioxide
                 films on silicon for {VAMFO} (variable angle
                 monochromatic fringe observation)",
  journal =      j-IBM-JRD,
  volume =       "12",
  number =       "2",
  pages =        "792--794",
  month =        mar,
  year =         "1968",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A6800
                 (Surfaces and interfaces; thin films and whiskers);
                 A7820 (Optical properties of bulk materials)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "compounds; light interferometry; optical films;
                 reflectivity; silicon; thickness measurement",
}

@Article{Cole:1969:CXL,
  author =       "H. Cole",
  title =        "Computer-operated {X}-ray laboratory equipment",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "5--14",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "instrumentation",
}

@Article{Grant:1969:AWG,
  author =       "P. M. Grant",
  title =        "Automation of a wide-range, general-purpose
                 spectrophotometric system",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "15--27",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765 (Optical spectroscopy and spectrometers); C7300
                 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "instrumentation; spectrophotometers",
}

@Article{McCann:1969:NRT,
  author =       "G. D. McCann",
  title =        "New research techniques for the life sciences",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "28--35",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition); C7300
                 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "biology; data reduction and analysis; pattern
                 recognition",
}

@Article{Johnson:1969:CS,
  author =       "B. Johnson and T. Kuga and H. M. Gladney",
  title =        "Computer-assisted spectroscopy",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "36--45",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0758 (Magnetic resonance spectrometers, auxiliary
                 instruments and techniques); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complete computer programs; instrumentation;
                 paramagnetic; radiofrequency spectrometers; resonance",
}

@Article{Wilburn:1969:COA,
  author =       "N. P. Wilburn and L. D. Coffin",
  title =        "Combination of on-line analysis with collection of
                 multicomponent spectra in an on-line computer",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "46--51",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A2960 (Counting circuits and nuclear electronics);
                 B7430 (Counting circuits and electronics for particle
                 physics); C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "apparatus; instrumentation; particle detectors;
                 radioactivity measuring",
}

@Article{Birnbaum:1969:IGS,
  author =       "J. Birnbaum and T. Kwap and M. Mikelsons and P.
                 Summers and J. F. Schofield and F. Carrubba",
  title =        "An interactive graphics system for nuclear data
                 acquisition",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "52--60",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A2000 (Nuclear physics); C7300 (Natural sciences
                 computing); C5540 (Terminals and graphic displays)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer graphic equipment; data acquisition; nuclear;
                 nuclear systems; physics",
}

@Article{Byerley:1969:SER,
  author =       "J. J. Byerley and T. Z. Fahidy",
  title =        "Simulation and experimental research",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "61--4",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350C (Control applications in metallurgical
                 industries); C7490 (Computing in other engineering
                 fields)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chemical technology; metallurgical industries;
                 simulation",
}

@Article{Lusebrink:1969:CFL,
  author =       "T. R. Lusebrink and C. H. Sederholm",
  title =        "Computer facilities for the laboratory",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "65--74",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "instrumentation; time-sharing programs",
}

@Article{Fryklund:1969:UTC,
  author =       "J. Fryklund and W. Loveland",
  title =        "Use of a time-sharing computer in nuclear chemistry",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "75--8",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "natural sciences; time-sharing systems",
}

@Article{Hannon:1969:COS,
  author =       "D. M. Hannon and D. E. Horne and K. L. Foster",
  title =        "Computer-controlled optical spectrometer",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "79--86",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765 (Optical spectroscopy and spectrometers); A4280D
                 (Optical monochromators); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complete computer programs; instrumentation;
                 monochromators",
}

@Article{Mollenauer:1969:GLC,
  author =       "J. F. Mollenauer",
  title =        "Growth of a laboratory computer system for nuclear
                 physics",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "87--92",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A2000 (Nuclear physics); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer facilities; nuclear physics; physics",
}

@Article{Davis:1969:MOT,
  author =       "J. B. Davis and H. H. Herd",
  title =        "Measuring optical transfer functions of lenses with
                 the aid of a digital computer",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "93--103",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4210F (Edge and boundary effects, optical
                 refraction); A4230L (Modulation and optical transfer
                 functions); A4230 (Optical information, image formation
                 and analysis); A4278 (Optical lens and mirror systems);
                 C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complete computer programs; instrument testing;
                 instrumentation; lenses; optical; optics",
}

@Article{Bell:1969:UCA,
  author =       "R. T. Bell and H. Overas",
  title =        "The use of computers at {CERN}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "104--113",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A2000 (Nuclear physics); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "nuclear physics; physics",
}

@Article{Reich:1969:EST,
  author =       "H. A. Reich",
  title =        "An experimental system for time-shared, on-line data
                 acquisition",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "114--118",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data acquisition; data communication systems; systems;
                 time-sharing",
}

@Article{Bevington:1969:RRN,
  author =       "P. R. Bevington",
  title =        "Real-time reduction of nuclear physics data",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "119--125",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A2000 (Nuclear physics); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data reduction and analysis; nuclear physics;
                 physics",
}

@Article{Okaya:1969:UCC,
  author =       "Y. Okaya",
  title =        "The use of a control computer in a chemistry
                 department",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "126--131",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "natural sciences",
}

@Article{Konnerth:1969:UTS,
  author =       "K. L. Konnerth",
  title =        "Use of a terminal system for data acquisition",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "1",
  pages =        "132--138",
  month =        jan,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data acquisition; data communication equipment;
                 online; operation; time-sharing systems",
}

@Article{Lesem:1969:KNW,
  author =       "L. B. Lesem and P. M. Hirsch and J. A. {Jordan, Jr.}",
  title =        "The kinoform: a new wavefront reconstruction device",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "150--155",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4350 (Holography); C7410B (Power engineering
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer applications; computers; electronics
                 applications of; holography; optics",
}

@Article{Gabor:1969:AHM,
  author =       "D. Gabor",
  title =        "Associative holographic memories",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "156--159",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4350 (Holography)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "holography",
}

@Article{Brown:1969:CBH,
  author =       "B. R. Brown and A. W. Lohmann",
  title =        "Computer-generated binary holograms",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "160--168",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4350 (Holography); C7410B (Power engineering
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electronics applications of computers; holography;
                 optics",
}

@Article{Wieder:1969:EBW,
  author =       "H. Wieder and R. V. Pole and P. F. Heidrich",
  title =        "Electron beam writing of spatial filters",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "169--171",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4150 (Electro-optical devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electro-optical effects; electron beam applications;
                 filters",
}

@Article{Gracer:1969:GCD,
  author =       "F. Gracer and R. A. Myers",
  title =        "Graphic computer-assisted design of optical filters",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "172--178",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7300 (Natural sciences computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer graphics; computer-aided design; optics",
}

@Article{Rabedeau:1969:STI,
  author =       "M. E. Rabedeau",
  title =        "Switchable total internal reflection light deflector",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "179--183",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4210 (Optical propagation and transmission in
                 homogeneous media); A4230 (Optical information, image
                 formation and analysis); C5320Z (Other digital
                 storage)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "light reflection; optical storage devices; optical
                 systems",
}

@Article{Tibbetts:1969:HPR,
  author =       "R. E. Tibbetts and J. S. Wilczynski",
  title =        "High performance reduction lenses for microelectronic
                 circuit fabrication",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "192--196",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "integrated circuit production; optics; photography",
}

@Article{Chaudhari:1969:MSR,
  author =       "P. Chaudhari",
  title =        "Mechanisms of stress relief in polycrystalline films",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "197--204",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6220 (Mechanical properties of solids (related to
                 microscopic structure)); A7360 (Electronic properties
                 of thin films)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "films; internal stresses",
}

@Article{Surkan:1969:SPO,
  author =       "A. J. Surkan",
  title =        "Symbolic polynomial operations with {APL}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "209--211",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1120 (Mathematical analysis); C6140D (High level
                 languages)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebra; procedure oriented languages",
}

@Article{Kennedy:1969:MIA,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "On the measurement of impurity atom distributions by
                 the differential capacitance technique",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "2",
  pages =        "212--214",
  month =        mar,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal atomic structure; crystal impurities;
                 materials; semiconductor",
}

@Article{Totta:1969:SDM,
  author =       "P. A. Totta and R. P. Sopher",
  title =        "{SLT} device metallurgy and its monolithic extension",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "226--238",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1260 (Pulse circuits); B1265 (Digital electronics);
                 B2550E (Surface treatment for semiconductor devices);
                 B2570 (Semiconductor integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "hybrid integrated circuits; integrated circuits; logic
                 circuits; monolithic",
}

@Article{Miller:1969:CCR,
  author =       "L. F. Miller",
  title =        "Controlled collapse reflow chip joining",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "239--250",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "integrated circuit production; soldering",
}

@Article{Goldmann:1969:GOC,
  author =       "L. S. Goldmann",
  title =        "Geometric optimization of controlled collapse
                 interconnections",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "251--265",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "integrated circuit production; soldering",
}

@Article{Norris:1969:RCC,
  author =       "K. C. Norris and A. H. Landzberg",
  title =        "Reliability of controlled collapse interconnections",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "266--271",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B2220 (Integrated circuits);
                 B2570 (Semiconductor integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "integrated circuit production; reliability",
}

@Article{Oktay:1969:PST,
  author =       "S. Oktay",
  title =        "Parametric study of temperature profiles in chips
                 joined by controlled collapse techniques",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "272--285",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "integrated circuit production; temperature
                 distribution",
}

@Article{Berry:1969:SSC,
  author =       "B. S. Berry and I. Ames",
  title =        "Studies of the {SLT} chip terminal metallurgy",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "286--296",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electrical contacts; integrated circuit production;
                 soldering",
}

@Article{Miranker:1969:PMA,
  author =       "W. L. Miranker",
  title =        "Parallel Methods for Approximating the Root of a
                 Function",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "297--301",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.50",
  MRnumber =     "39 \#1109",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0220 (Mathematical analysis); C1120 (Mathematical
                 analysis)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "approximation theory; function evaluation; iterative;
                 mathematics; methods",
}

@Article{Dave:1969:SER,
  author =       "J. V. Dave",
  title =        "Scattering of electromagnetic radiation by a large,
                 absorbing sphere",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "302--313",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4110H (Electromagnetic waves: theory); B5210
                 (Electromagnetic wave propagation)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electromagnetic wave scattering",
}

@Article{Hill:1969:GMO,
  author =       "Y. M. Hill and N. O. Reckord and D. R. Winner",
  title =        "A general method for obtaining impedance and coupling
                 characteristics of practical microstrip and triplate
                 transmission line configurations",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "314--322",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1310 (Waveguides)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "strip lines",
}

@Article{Janak:1969:TEC,
  author =       "J. F. Janak",
  title =        "Thermal expansion in a constrained elastic cylinder",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "3",
  pages =        "323--330",
  month =        may,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6570 (Thermal expansion and thermomechanical
                 effects)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "stress analysis; thermal expansion",
}

@Article{Abraham:1969:SMM,
  author =       "C. T. Abraham and R. D. Prasad",
  title =        "Stochastic model for manufacturing cost estimating",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "343--350",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "271.90013",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290D (Systems theory applications in economics and
                 business); C1290F (Systems theory applications in
                 industry)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "economics; manufacturing processes; modelling",
}

@Article{elAgizy:1969:DIM,
  author =       "M. N. {el Agizy}",
  title =        "Dynamic inventory models and stochastic programming",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "351--356",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290F (Systems theory applications in industry)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "management; modelling",
}

@Article{Evers:1969:PAC,
  author =       "W. H. Evers and S. S. Thakur",
  title =        "Programmed automatic customer engineer ({PACE})
                 dispatch",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "357--365",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290F (Systems theory applications in industry)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "management science",
}

@Article{Savir:1969:MCT,
  author =       "D. Savir",
  title =        "Model of competition in a two-seller market",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "366--372",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290D (Systems theory applications in economics and
                 business); C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "marketing; modelling; operations research",
}

@Article{Arinal:1969:MBU,
  author =       "J.-C. Arinal",
  title =        "Maximal biflow in an undirected network",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "373--379",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "39 \#5245",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "275.90039",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290D (Systems theory applications in economics and
                 business); C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "marketing; operations research",
}

@Article{Donath:1969:AAB,
  author =       "W. E. Donath",
  title =        "Algorithm and average-value bounds for assignment
                 problems",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "380--386",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290F (Systems theory applications in industry);
                 C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "management science; operations research",
}

@Article{Hu:1969:SDA,
  author =       "T. C. Hu and W. T. Torres",
  title =        "Shortcut in the decomposition algorithm for shortest
                 paths in a network",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "387--390",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "39 \#5251",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290F (Systems theory applications in industry);
                 C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "operations research; PERT; subroutines",
}

@Article{Raimond:1969:MPD,
  author =       "J.-F. Raimond",
  title =        "Minimaximal paths in disjunctive graphs by direct
                 search",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "391--399",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.30",
  MRnumber =     "39 \#5252",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "251.90049",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290F (Systems theory applications in industry);
                 C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "control; manufacturing processes; operations research;
                 process; production",
}

@Article{Raymond:1969:HAT,
  author =       "T. C. Raymond",
  title =        "Heuristic algorithm for the traveling-salesman
                 problem",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "400--407",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290D (Systems theory applications in economics and
                 business); C1290F (Systems theory applications in
                 industry); C1290 (Applications of systems theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "economics; management science; operations research;
                 subroutines",
}

@Article{Corby:1969:IVD,
  author =       "B. Corby",
  title =        "{IBM} 2750 voice and data switching system:
                 organization and functions",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "408--415",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210M (ISDN); B6230B (Electronic switching systems
                 and exchanges); B6230D (Other telephone exchanges)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "private telephone exchanges; switching systems",
}

@Article{Reynier:1969:ESN,
  author =       "R. E. Reynier",
  title =        "Electronic switching network of the {IBM} 2750",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "416--427",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6230B (Electronic switching systems and exchanges);
                 B6230D (Other telephone exchanges)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "private telephone exchanges; switching circuits",
}

@Article{Colas:1969:OPI,
  author =       "J. D. Colas",
  title =        "Operational program for the {IBM} 2750",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "428--438",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6230 (Switching centres and equipment); C3370
                 (Control applications in telecommunications)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "communications applications of control; switching
                 systems",
}

@Article{Rosier:1969:SC,
  author =       "L. L. Rosier and C. Turrel and W. K. Liebmann",
  title =        "Semiconductor crosspoints",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "439--446",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560H (Junction and barrier diodes); B6230 (Switching
                 centres and equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "semiconductor devices; switching circuits",
}

@Article{Rocher:1969:RTT,
  author =       "E. Y. Rocher and R. E. Reynier",
  title =        "Response time of thyristors: theoretical study and
                 application to electronic switching networks",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "447--455",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560L (Thyristors and silicon controlled rectifiers);
                 B6230B (Electronic switching systems and exchanges)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "switching circuits; thyristors",
}

@Article{Griffith:1969:DRP,
  author =       "R. L. Griffith",
  title =        "Data recovery in a photo-digital storage system",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "456--467",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320Z (Other digital storage)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data acquisition; optical storage devices",
}

@Article{Mitchell:1969:MPE,
  author =       "F. H. {Mitchell, Jr.} and W. R. Mahaffey and R. F.
                 Jacob",
  title =        "Modeling plasma effects on radar cross section of
                 reentry vehicles",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "4",
  pages =        "468--474",
  month =        jul,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6310 (Radar theory)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "plasma; radar cross-sections; space vehicles",
}

@Article{Bray:1969:PAI,
  author =       "R. Bray",
  title =        "A perspective on acoustoelectric instabilities",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "487--493",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Instabilities in piezoelectricallly active
                 semiconductors in terms of experiments on III-V
                 semiconductors, selected to limit or control variables;
                 detailed evidence is presented that source of acoustic
                 flux is thermal equilibrium phonon spectrum; individual
                 contributions of various factors to instabilities are
                 identified and discussed; several aspects of deviation
                 from small signal theory are identified.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators)",
  corpsource =   "Purdue Univ., Lafayette, IN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "acoustoelectric effects; piezoelectric; semiconductor
                 materials; semiconductors, acoustic effect",
}

@Article{Zemon:1969:PAF,
  author =       "S. Zemon and J. Zucker",
  title =        "Parametric Amplification and Frequency Shifts in the
                 Acoustoelectric Effect",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "494--499 (or 494--498??)",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Mechanisms for downshift in frequency of maximum
                 acoustic intensity for high flux domains in
                 piezoelectric semiconductors are reviewed; for simple
                 case where externally introduced acoustic wave (pump)
                 produces single-frequency domain in photoconducting
                 CdS, clear evidence is given that downshift is due to
                 parametric amplification of thermal acoustic noise;
                 downshifting in region where deviations from linear
                 theory are still small is discussed in terms of
                 parametric interaction model.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560F (Bulk effect devices); B2810F (Piezoelectric
                 and ferroelectric materials)",
  corpsource =   "General Telephone and Electronics Labs. Inc., Bayside,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "noise; parametric amplifiers; piezoelectric materials;
                 semiconductors, acoustic effect",
}

@Article{Spears:1969:BSS,
  author =       "D. L. Spears",
  title =        "{Brillouin} Scattering Study of Acoustoelectric Domain
                 Formation in $n$-{GaAs}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "499--502",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Brillouin scattering measurements in n-GaAs show that
                 initial formation of acoustoelectric domains is
                 consequence of spatially inhomogeneous amplification
                 produced by resistivity inhomogeneities, and that
                 subsequent stages of domain evolution involve
                 flux-dependent processes which further shape domain;
                 important process appears to be parametric frequency
                 conversion.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6265 (Acoustic properties of solids); A7220
                 (Electrical conductivity phenomena in semiconductors
                 and insulators); A7835 (Brillouin and Rayleigh
                 scattering (condensed matter))",
  corpsource =   "M.I.T. Lexington, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "acoustic effects; acoustoelectric effects; arsenide;
                 Brillouin spectra; gallium; semiconductor materials;
                 semiconductors",
}

@Article{Moore:1969:OAD,
  author =       "A. R. Moore and R. W. Smith and P. Worcester",
  title =        "Off-Axis Acoustoelectric Domains in {CdS}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "503--506",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In CdS crystals oriented with electric drift field
                 parallel to c axis, acoustoelectric domains consist of
                 off-axis shear waves; stroboscopic strain-birefrigent
                 method was used to observe off-axis domains directly;
                 domain tilt angle has been found to depend on drift
                 velocity in roughly same way as predicted from
                 small-signal angular dependence theory; discrepancies
                 may be result of large-signal effects or of angular
                 dispersion.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7250 (Acoustoelectric
                 effects (electronic transport)); A7820F (Birefringence
                 (condensed matter))",
  corpsource =   "RCA Labs. Princeton, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "acoustic effects; acoustoelectric effects;
                 birefringence; cadmium compounds; mechanical;
                 semiconductor materials; semiconductors",
}

@Article{Route:1969:AAI,
  author =       "R. K. Route and G. S. Kino",
  title =        "Acoustoelectric Amplification in {InSb}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "507--509",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In study of two modes of acoustoelectric domain
                 oscillation which occur in InSb in transverse magnetic
                 field, lithium niobate transducers on acoustic
                 amplifier were used to measure linear acoustic gain as
                 function of electric and magnetic field and frequency;
                 at low magnetic fields, wavelength of sound waves is
                 less than mean free path of electrons, and macroscopic
                 theories break down; extending microscopic theory of
                 magnetacoustic interactions to include electron drift
                 gives excellent agreement between theory and experiment
                 and results account for two modes of acoustic domain
                 formation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7250 (Acoustoelectric
                 effects (electronic transport))",
  corpsource =   "Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "acoustic effects; acoustoelectric effects; effects;
                 indium antimonide; magnetoacoustic; semiconductor
                 materials; semiconductors",
}

@Article{Pearson:1969:CSG,
  author =       "A. D. Pearson",
  title =        "Characteristics of Semiconducting Glass
                 Switching\slash Memory Diodes",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "510--514",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental studies of three conducting states
                 exhibited by semiconducting glass diodes, and memory
                 function they display when appropriately pulsed;
                 laboratory operation of simple diodes and methods of
                 inducing transitions among \%various states; possible
                 role of phase changes in mechanism of device operation;
                 new evidence in support of filamentary conduction
                 hypothesis.",
  acknowledgement = ack-nhfb,
  affiliation =  "Murray Hill",
  affiliationaddress = "Murray Hill, NJ, USA",
  classcodes =   "B2560Z (Other semiconductor devices)",
  corpsource =   "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "diode; glass; memory devices; semiconductor devices;
                 semiconductor diodes; semiconductor storage devices;
                 semiconductors, switching",
}

@Article{Fritzsche:1969:PIA,
  author =       "U. H. Fritzsche",
  title =        "Physics of Instabilities in Amorphous Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "515--521 (or 515--520??)",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Four-fold classification of current-controlled
                 instabilities in amorphous semiconductors is proposed;
                 experimental evidence supporting simple band model for
                 amorphous covalent alloys is given; present
                 understanding of reversible switching effects and of
                 switching with memory is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2560Z (Other
                 semiconductor devices)",
  corpsource =   "Univ. Chicago, IL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "amorphous state; electric properties; modelling;
                 semiconductor materials; W R",
  xxauthor =     "H. Fritzsche",
}

@Article{Barnett:1969:CFS,
  author =       "A. M. Barnett",
  title =        "Current Filaments in Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "522--528",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Review of work that has been carried out on
                 double-injection current filaments, emphasizing similar
                 observations in direct-energy-gap semiconductor,
                 gallium arsenide and indirect-gap semiconductor,
                 silicon; experimental observations of current filaments
                 occurring in low-current region, where current
                 increases at constant voltage, and in high-current
                 power-law region; simplified theory that considers
                 current distribution of filament, and characteristic
                 curve in high-current power-law region.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B2560Z (Other
                 semiconductor devices)",
  corpsource =   "General Electric Co., Schenectady, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; semiconductor devices;
                 semiconductor materials",
}

@Article{Streetman:1969:COD,
  author =       "B. G. Streetman and N. {Holonyak, Jr.}",
  title =        "Current Oscillations in Deep-Level Doped
                 Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "529--532",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Review of various experimental observations of current
                 oscillations in p-i-n (and optically excited n-i-n)
                 devices containing deep levels which occur in positive
                 resistance region of spacecharge-limited current regime
                 of I-V characteristics, before occurrence of
                 double-injection breakdown; requirements which model
                 for oscillations must satisfy, and proposed model in
                 which recombination process unbalances steady or d-c
                 space charge.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560Z (Other semiconductor devices)",
  corpsource =   "Univ. Illinois, Champaign-Urbana, IL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "devices; electric properties; ion; JR; oscillations;
                 semiconductor; semiconductor device models",
  xxauthor =     "B. G. Streetman and J. {Holonyak, Jr.}",
}

@Article{Hagenlocher:1969:SCI,
  author =       "A. K. Hagenlocher and W. T. Chen",
  title =        "Space-charge-limited current instabilities in n$^+$ --
                 $\pi$ -- n$^+$ silicon diodes",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "533--536",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements of instability in nickel-doped 25,000
                 ohm-cm silicon when strength of pulsed electric field
                 is varied above and below threshold; at threshold
                 nickel centers become ionized, and positive space
                 charge is created in center of sample; this
                 nonequilibrium distribution, which persists for period
                 of 200 to 300 $\mu$ sec, has properties similar to
                 those of gaseous plasma.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560H (Junction and barrier diodes)",
  corpsource =   "General Telephone and Electronics Labs. Inc., Bayside,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; MJ; semiconductor devices, diode;
                 semiconductor diodes; semiconductors",
  xxnote =       "Check math in title??",
}

@Article{Rees:1969:TRH,
  author =       "H. D. Rees",
  title =        "Time Response of the High-Field Electron Distribution
                 Function in {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "537--542",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Techniques used in iterative calculation of
                 steady-state and time-dependent high-field electron
                 distribution function for GaAs, its small-signal
                 frequency response and its behavior in large sinusoidal
                 electric fields; calculations concentrate on frequency
                 range from d-c to about 100 GHz; computed results for
                 response speed, threshold field for negative
                 conductivity, negative mobility, oscillator efficiency,
                 and free-electron dielectric constant.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology)",
  corpsource =   "Royal Radar Establ., Malvern, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric fields; electric properties; hem;
                 semiconductor materials; semiconductors",
}

@Article{McGroddy:1969:NCE,
  author =       "J. C. McGroddy and M. I. Nathan and J. E. {Smith,
                 Jr.}",
  title =        "Negative conductivity effects and related phenomena in
                 germanium. {I}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "543--553",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Review of recent work on current instabilities, caused
                 by bulk negative differential conductivity in extrinsic
                 material, and related properties of germanium in high
                 electric fields; general subject of high field
                 transport in n-Ge with emphasis on concept of saturated
                 drift velocity; transferred carrier mechanism for
                 producing bulk negative differential conductivity;
                 recent work on other materials is summarized.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280C (Conductivity of
                 elemental semiconductors); B2550 (Semiconductor device
                 technology)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; electrical conductivity;
                 electrical conductivity of solids; elemental
                 semiconductors; germanium; JR; semiconductor materials;
                 semiconductors",
}

@Article{Smith:1969:NCE,
  author =       "J. E. {Smith, Jr.} and M. I. Nathan and J. C.
                 McGroddy",
  title =        "Negative conductivity effects and related phenomena in
                 germanium. {II}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "554--561",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280C (Conductivity of
                 elemental semiconductors); B2550 (Semiconductor device
                 technology)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electrical conductivity; electrical conductivity of
                 solids; elemental semiconductors; germanium;
                 semiconductor materials",
}

@Article{Paige:1969:BND,
  author =       "E. G. S. Paige",
  title =        "Bulk negative differential conductivity in germanium:
                 theory",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "562--567",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280C (Conductivity of
                 elemental semiconductors); B2550 (Semiconductor device
                 technology)",
  corpsource =   "Royal Radar Establ., Malvern, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electrical conductivity; electrical conductivity of
                 solids; elemental semiconductors; germanium; Monte
                 Carlo methods; semiconductor materials",
}

@Article{Baynham:1969:WPN,
  author =       "A. C. Baynham",
  title =        "Wave Propagation in Negative Differential Conductivity
                 Media. {n-Ge}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "568--572",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In study of transverse electromagnetic wave
                 propagation in negative differential resistance medium
                 provided by suitably oriented n-type germanium at 77 K,
                 wave frequency is chosen to fall below critical
                 scattering rates in this system (1 GHz), and sample
                 dimensions are maintained below critical length for
                 domain formation; wave amplification is noted and real
                 and imaginary parts of conductivity are evaluated
                 throughout d-c bias field range of range of
                 resistivities.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280C (Conductivity of
                 elemental semiconductors); A7820 (Optical properties of
                 bulk materials)B2560Z (Other semiconductor devices);
                 B5210 (Electromagnetic wave propagation)",
  corpsource =   "Royal Radar Establ., Malvern, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; electromagnetic wave propagation;
                 elemental semiconductors; germanium; media; resistance
                 (electric); Ru; semiconductors",
}

@Article{Boer:1969:TCF,
  author =       "K. W. Boer",
  title =        "Trap-Controlled Field Instabilities in Photoconducting
                 {CdS} Caused by Field-Quenching",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "573--579",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Formation of stationary high-field domains adjacent to
                 cathode or anode, dependent on contact potential of
                 electrodes, their widening with increased applied
                 voltage and their transition into two types of moving
                 domains; domains which move under deformation of domain
                 profile and usually dissolve before they reach anode,
                 and nearly undeformed moving domains; structure and
                 kinetics of these domains are directly observed using
                 Franz-Keldysh effect and photographs of typical domain
                 forms are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B4200 (Optoelectronic materials and devices)",
  corpsource =   "Univ. Delaware, Newark, DE, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "photoconducting materials; photoelectric;
                 semiconductors",
  xxauthor =     "K. W. Boeer",
}

@Article{McGroddy:1969:EHP,
  author =       "J. C. McGroddy and M. I. Nathan and W. Paul and S.
                 Porowski and J. E. {Smith, Jr.} and W. P. Dumke",
  title =        "Effects of Hydrostatic Pressure on Hot-Electron
                 Phenomena in {n-InSb}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "580--582",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In study of effect of hydrostatic pressure on Gunn
                 effect (high pressures) and bulk avalanche breakdown
                 (low pressures) in n-InSb, measured generation rates of
                 electron-hole pairs at 77 and 195 K at several
                 pressures are compared with theory of Dumke.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7000 (Condensed matter: electronic structure,
                 electrical, magnetic, and optical properties); A7220
                 (Electrical conductivity phenomena in semiconductors
                 and insulators)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "effect; electric breakdown; electric breakdown of
                 solids; electric properties; Gunn; high-pressure
                 phenomena and effects; III-V; indium antimonide; JR;
                 semiconductor materials; semiconductors",
}

@Article{Lorenz:1969:LCB,
  author =       "M. R. Lorenz and J. C. McGroddy and T. S. Plaskett and
                 S. Porowski",
  title =        "Location of the (111) conduction band minima in the
                 {Ga$_x$\slash In$_{1-x}$\slash Sb} alloy system",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "583--586",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:34:19 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Pressure dependence of resistivity and optical
                 absorption by conduction band electrons are used to
                 determine position of 111 (L') conduction band minima
                 in Ga In Sb alloy system; these experimental data
                 permit more precise estimate of position of L$_1$
                 minima than had been possible using Gunn effect data
                 alone.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "alloys; band structure; electric properties; gallium
                 compounds; materials; semiconductor",
}

@Article{Shaw:1969:IBC,
  author =       "M. P. Shaw and P. R. Solomon and H. L. Grubin",
  title =        "Influence of Boundary Conditions on Current
                 Instabilities in {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "587--590",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Excellent agreement is obtained among experiments
                 eliciting variety of GaAs current instabilities and
                 results of computer simulation of GaAs with various
                 fields imposed at cathode boundary; cathode boundary
                 field controls manifestation of instability and
                 determines whether Gunn effect or another instability
                 occurs; model is capable of predicting details of
                 various instabilities, and by comparing experiment with
                 theory, it is possible to determine carrier
                 concentration and drift mobility of each sample.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  corpsource =   "United Aircraft Res. Lab., East Hartford, CT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; electrical conductivity of
                 solids; gallium arsenide; III-V; ion; semiconductor
                 materials; semiconductors",
}

@Article{Gunn:1969:TTD,
  author =       "J. B. Gunn",
  title =        "Topological Theory of Domain Velocity in
                 Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "591--595",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See comment \cite{Aas:1970:CTT}.",
  abstract =     "Theory is given for velocity of free, steadily
                 traveling domain of high electric field in
                 semiconductor exhibiting negative differential
                 conductivity; explicit results are derived for cases
                 for which domain behavior is dominated either by
                 (electric-field dependent) diffusion of electron, or by
                 rate of transfer of electrons between states having
                 different mobilities; solution for electric-field
                 distribution has required properties only if system of
                 differential equations involved possesses singular
                 points with special topological properties.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7170C (Crystal and ligand fields); A7220 (Electrical
                 conductivity phenomena in semiconductors and
                 insulators); A7280 (Conductivity of specific
                 semiconductors and insulators); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "crystal internal fields; electric properties;
                 semiconductor materials; semiconductors",
}

@Article{Bartelink:1969:ASF,
  author =       "D. J. Bartelink and D. L. Scharfetter",
  title =        "Avalanche Shock Fronts in {P-N} Junctions",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "596--600",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Conditions necessary for formation of avalanche shock
                 fronts, narrow layers of avalanche moving through diode
                 depletion layer faster than carrier saturated drift
                 velocity, are shown to be related to large-signal
                 limits of Read and more general avalanche transit time
                 diode theory; analysis of shock fronts by simple
                 analytic method has been used to interpret computer
                 simulations of high efficiency microwave oscillator
                 diodes; oscillation mode, called Trapatt mode, involves
                 compensated electron-hole plasma that is trapped in
                 depletion layer for portion of each cycle.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340 (Electrical and electronic properties of
                 interfaces); B1350F (Solid-state microwave circuits and
                 devices); B2530B (Semiconductor junctions); B2530
                 (Semiconductor junctions and interfaces); B2560H
                 (Junction and barrier diodes)",
  corpsource =   "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "junctions; microwave oscillators; semiconductor;
                 semiconductor diodes; semiconductors; shock waves",
}

@Article{Robinson:1969:CME,
  author =       "B. B. Robinson and G. A. Swartz",
  title =        "Coherent Microwave Emission from an Electron-Hole
                 Plasma",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "601--606",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Coherent microwave radiation, 6.5 to 44 GHz, is
                 generated by In Sb at 77 K with injected electron
                 current transverse to magnetic field; theory of
                 double-stream interaction in thin plasma layer with
                 magnetic field transverse to current flow predicts
                 instabilities in observed frequency range; theory
                 predicts all of qualitative and several of quantitative
                 features of observed emission; noise emission is
                 predicted and observed at temperatures up to room
                 temperature with appropriate onset magnetic fields.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B1350F (Solid-state
                 microwave circuits and devices); B2560Z (Other
                 semiconductor devices)",
  corpsource =   "RCA Labs., Princeton, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "materials; microwave generation; plasma stability;
                 semiconductor; semiconductors",
}

@Article{Persky:1969:NDM,
  author =       "G. Persky and D. J. Bartelink",
  title =        "Negative Differential Mobility in Nonparabolic Bands",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "607--610",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:08 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Strong NDM (negative differential mobility) in n-InSb
                 at low temperatures is predicted from single
                 nonparabolic band model; calculations allowing for
                 anisotropy of distribution function have been made
                 using drifted Maxwellian, and `two-temperature' model;
                 calculated NDM threshold field of 550 v/cm is in
                 observable field range in p-n junctions; in bulk
                 samples, where breakdown occurs at approximately 200
                 v/cm, domain nucleation may take place at high-field
                 inhomogeneities and contribute to dynamics of breakdown
                 process and attendant microwave emission.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  corpsource =   "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; electrical conductivity of
                 solids; electron mobility; III-V; indium antimonide;
                 materials; modelling; semiconductor; semiconductors",
}

@Article{Turner:1969:RAW,
  author =       "C. W. Turner",
  title =        "The role of acoustic wave amplification in the
                 emission of microwave noise from {InSb}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "611--615",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630L (Measurement of basic electric and magnetic
                 variables)A4100 (Electricity and magnetism; fields and
                 charged particles); A6265 (Acoustic properties of
                 solids); A7000 (Condensed matter: electronic structure,
                 electrical, magnetic, and optical properties); A7220
                 (Electrical conductivity phenomena in semiconductors
                 and insulators); A7250 (Acoustoelectric effects
                 (electronic transport)); B1350F (Solid-state microwave
                 circuits and devices)",
  corpsource =   "Univ. California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acoustoelectric effects; crystal orientation; III-V;
                 indium antimonide; microwave generation; noise;
                 semiconductor materials; semiconductors",
}

@Article{Thompson:1969:NEI,
  author =       "A. H. Thompson and G. S. Kino",
  title =        "Noise emission from {InSb}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "616--620",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560F (Bulk effect devices)",
  corpsource =   "Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "magnetic fields; noise; probes; semiconductor
                 materials",
}

@Article{Ferry:1969:MEH,
  author =       "D. K. Ferry and W. A. Porter",
  title =        "Microwave Emission and High-Frequency Oscillations in
                 $n$-Type {InSb}",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "621--625",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In study of microwave emission from n-InSb and 77 K in
                 presence of electric and magnetic fields, rectangular
                 InSb samples were cut so that long dimension and
                 applied electric field were parallel to one of
                 crystallographic axes 100, 110, or 111 and so that
                 position of all other axes was known; instabilities in
                 voltage across InSb sample accompanied microwave
                 emission and, for limited range of electric and
                 magnetic fields, these instabilities were in form of
                 coherent oscillations; close correspondence between two
                 effects was demonstrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B1350F (Solid-state
                 microwave circuits and devices); B2560Z (Other
                 semiconductor devices)",
  corpsource =   "Texas Technol. Coll., Lubbock, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "em; microwave generation; semiconductor materials;
                 semiconductors",
}

@Article{Glicksman:1969:SME,
  author =       "M. Glicksman",
  title =        "Summary of Microwave Emission from {InSb}. Gross
                 Features and Possible Explanations",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "5",
  pages =        "626--630",
  month =        sep,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Review of experimental observations of microwave
                 emission from InSb and theories proposed to explain
                 these; two sources for some of radiation,
                 acoustoelectric interaction and collision-induced
                 plasma instability, appear reasonably well established;
                 experiments are proposed to clarify number of still
                 unanswered questions.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B1350F (Solid-state
                 microwave circuits and devices); B2560Z (Other
                 semiconductor devices)",
  corpsource =   "RCA Labs., Princeton, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research",
  keywords =     "acoustoelectric effects; microwave generation; plasma;
                 semiconductor materials; semiconductors; stability",
}

@Article{Marcus:1969:EDM,
  author =       "P. M. Marcus and F. P. Jona and D. W. Jepsen",
  title =        "Energy Diagram Method for {Bragg} Reflections in Low
                 Energy Electron Diffraction ({LEED}) Spectra",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "646--661",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A point of view and a method of calculation derived
                 from energy band theory are applied to the problem of
                 finding energies of Bragg reflections from a given
                 crystal. Energy curves are defined and calculated which
                 describe the behavior of individual diffracted electron
                 beams for a given set of beams incident on a particular
                 face of the crystal. Intersections of these curves
                 correspond to and identify the Bragg reflections
                 associated with each beam. Energy diagrams and Bragg
                 peak positions are shown for simple cubic face-centered
                 cubic lattices for various angles of incidence.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6114 (Electron determination of structures)",
  corpsource =   "IBM Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "crystals, electronic properties; electron diffraction
                 crystallography; physics; solid state; spectra; Te",
}

@Article{Kennedy:1969:TMA,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "Two-Dimensional Mathematical Analysis of a Planar Type
                 Junction Field-Effect Transistor",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "662--674",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This analysis of the steady-state mechanisms of
                 operation within the transistor shows that the
                 potential distribution within the source-drain channel
                 follows from solutions of Poisson's equation rather
                 than from Laplace's equation. In particular,
                 velocity-limited carrier transport produces a region of
                 carrier accumulation in a region of the source-drain
                 channel previously assumed to be depleted of carriers
                 by the gate junction space-charge layers. The results
                 are presented in graphic form.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM, E. Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "field effect; field effect transistors; mathematics;
                 transistors",
}

@Article{Jelinek:1969:FSD,
  author =       "F. Jelinek",
  title =        "Fast Sequential Decoding Algorithm Using a Stack",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "675--685",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "41 \#3166",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This algorithm, which uses stack storage at the
                 receiver, is much simpler to describe and analyze than
                 the Fano algorithm, and is about six times faster than
                 the latter at transmission rates equal to the rate
                 below which the average number of decoding steps is
                 bounded by a constant. Practical problems connected
                 with implementing the stack algorithm are discussed and
                 a scheme is described that facilitates satisfactory
                 performance even with limited stack storage capacity.
                 Preliminary simulation results estimating the decoding
                 effort and the needed stack size are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  corpsource =   "Cornell Univ., Ithaca, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "algorithms; decoding; decoding algorithms; information
                 theory; me",
  reviewer =     "E. R. Berlekamp",
}

@Article{Pennebaker:1969:RSS,
  author =       "W. B. Pennebaker",
  title =        "{RF} sputtered strontium titanate films",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "686--695",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6870 (Whiskers and dendrites: growth, structure, and
                 nonelectronic properties); A7740 (Dielectric loss and
                 relaxation)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "dielectric properties of solids; films; sputtering;
                 strontium compounds",
}

@Article{Sawatzky:1969:CDR,
  author =       "E. Sawatzky and E. Kay",
  title =        "Cation Deficiencies in {RF} Sputtered Gadolinium Iron
                 Garnet Films",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "696--702",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "RF sputtering of stoichiometric, polycrystalline
                 gadolinium iron garnet material results in films
                 significantly deficient in iron content. The cation
                 deficiency is shown to be quite sensitive to
                 preparatory conditions and reflects itself markedly in
                 the magnetic and structural properties of the resultant
                 films. A simultaneously operated RF-D-C two-target
                 sputtering system is described in some detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6870 (Whiskers and dendrites: growth, structure, and
                 nonelectronic properties)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "ERI; films; gadolinium compounds; magnetic materials,
                 ferromagnet; RF sputtering; semiconductor devices,
                 film; sputtering; thin films",
}

@Article{Pehrson:1969:NDF,
  author =       "B. Pehrson",
  title =        "A nonlinear digital filter for industrial
                 measurements",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "703--710",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Time series arising from observations made on
                 industrial processes sometimes contain components that
                 make it necessary to use a nonlinear filter to extract
                 the signal. A simple algorithm is presented for
                 nonlinear filtering of a time series composed of a
                 Gaussian component, pulses and steps. The method used
                 is a combination of simple statistical techniques. The
                 main advantage is claimed to be a scheme for adaptation
                 of the filter parameters.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1270 (Filters and other networks)",
  corpsource =   "Univ. Uppsala, Sweden",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "algorithms; automatic control, optimization; digital
                 filters; industrial plants; information theory; signal
                 processing; statistical methods",
}

@Article{Sugerman:1969:STD,
  author =       "A. Sugerman and S. Schmidt and Y. O. Tu",
  title =        "Strain and Temperature Distributions in a
                 Thermally-Activated Cantilever",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "711--716",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A mathematical model is used to predict the behavior
                 of an electromechanical semiconductor oscillator. The
                 device being simulated is a silicon cantilever, free at
                 one end, periodically heated on a small segment of one
                 surface by an embedded resistor, and having as heat
                 sink the fixed-end mechanical support (pedestal) on the
                 opposite surface. The model defines the strain and
                 temperature distributions in the cantilever as
                 functions of geometry, material constants, and input
                 power; its application is to determine the conditions
                 that will maximize strain in the region near the
                 pedestal for a specified power source.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "beams and girders; heat transfer; oscillators;
                 structural design, analogies",
}

@Article{Dixon:1969:MMP,
  author =       "R. C. Dixon and P. E. Boudreau",
  title =        "Mathematical Model for Pattern Verification",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "717--721",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Pattern verification is mathematically defined, an
                 appropriate decision function is derived, and a measure
                 of system evaluation is given. Two basic postulates are
                 set forth to fully define a verification system-each
                 known class is expected, with nonzero probability, to
                 be verified under the correct class label; and the
                 pattern vector extracted during verification should be
                 descriptive of the given class, independent of which
                 class lab\%l was entered into the system.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1220 (Simulation, modelling and
                 identification)C1250 (Pattern recognition)",
  corpsource =   "IBM, Raleigh, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "analogies; modelling; pattern recognition; pattern
                 recognition systems; statistical methods",
}

@Article{Harris:1969:ODL,
  author =       "E. P. Harris and M. L. Dakss",
  title =        "Optical Damage to {LiNbO}$_3$ from {GaAs} Laser
                 Radiation",
  journal =      j-IBM-JRD,
  volume =       "13",
  number =       "6",
  pages =        "722--723",
  month =        nov,
  year =         "1969",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Optical damage to LiNbO$_3$ at room temperature from
                 focused cw GaAs laser radiation at a wavelength of 8450
                 A was observed. Visible damage was apparent after a
                 20-sec exposure corresponding to an energy flux of
                 about 1.2x10$_5$ J/cm$_2$ and was observed by changes
                 in the diffraction pattern of the crystal. This is
                 believed to be the first report of such damage in the
                 potentially useful wavelength range of 0.8 to 0.9 Um.
                 No damage was observed at a wavelength of 9030A in a
                 similar but pulsed-laser experiment.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180B (Ultraviolet, visible and infrared radiation
                 effects)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "crystals; electron optics; gallium arsenide; laser
                 beam effects; light, high intensity; lithium compounds;
                 optical materials; optical properties; radiation
                 effects; ROG; semiconductor lasers",
}

@Article{Sedgwick:1970:DFG,
  author =       "T. O. Sedgwick and J. A. Aboaf and S. Krongelb",
  title =        "Dielectric films for {Ge} planar devices",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "2--11",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550E (Surface treatment for semiconductor devices);
                 B2550G (Lithography); B2560F (Bulk effect devices);
                 B2890 (Other dielectric applications and devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "masks; semiconductor devices; thin films",
}

@Article{Price:1970:THE,
  author =       "P. J. Price",
  title =        "The theory of hot electrons",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "12--24",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Methods of analysis of hot-electron phenomenon in
                 semiconductors are surveyed. Procedures for obtaining
                 and solving equations involving f only, based on a new
                 approach due to Levinson, are developed. An inherently
                 precise method for calculating f and related treatment
                 of differential mobility, which requires computer
                 implementation and which has recently come into use, is
                 expounded. Test calculations for the case of
                 n-germanium are reported.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electrical conductivity of solids; electron mobility;
                 elemental semiconductors; germanium; materials;
                 physics, solid state; semiconductor; semiconductors",
}

@Article{Gayles:1970:OFM,
  author =       "J. N. {Gayles, Jr.} and W. L. Honzik and D. O.
                 Wilson",
  title =        "On-Line Far-Infrared {Michelson} Interferometry in a
                 Time-Shared Mode",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "25--32",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method is described for implementing real-time
                 far-infrared Fourier spectroscopy in time-shared
                 environment. The system makes use of the IBM 1800
                 TSX-based General Experimental Monitor (GEM) and
                 reduces by at least an order of magnitude the time
                 between experiment initiation and the display of useful
                 spectral frequency and intensity information. The
                 system includes conversational mode operation with the
                 incomplete data array, permitting review at any
                 interval of the Fourier transform of the partially
                 acquired data without in any way disturbing the process
                 of data collection. Procedures are illustrated also for
                 performing signal averaging and several comparatively
                 routine spectroscopic tasks.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765 (Optical spectroscopy and spectrometers); C5420
                 (Mainframes and minicomputers); C7300 (Natural sciences
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "Fourier analysis; instrumentation; light
                 interferometry; online operation; spectroscopy;
                 time-sharing systems",
}

@Article{Billingsley:1970:EHS,
  author =       "D. S. Billingsley",
  title =        "On the Equations of {Holland} in the Solution of
                 Problems in Multicomponent Distillation",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "33--40",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Holland developed certain equations to be used to
                 accelerate or induce convergence in multicomponent
                 distillation calculations. In practice this procedure
                 has been the most successful of any adjunct to the
                 basic Thiele-Geddes or Lewis-Matheson procedure for
                 solving these problems. It is of importance, therefore,
                 to ascertain the conditions under which the Holland
                 equations can be guaranteed to possess the required
                 type of solution at each iteration. The types of
                 specifications which fulfill these conditions are
                 determined.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "calculations; chemical processes; mathematics; VIG",
}

@Article{Bohlin:1970:MLM,
  author =       "T. Bohlin",
  title =        "On the maximum likelihood method of identification",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "41--51",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The maximum likelihood principle of estimation applied
                 to the linear black-box identification problem gives
                 model with theoretically attractive properties. Further
                 developments of the method are presented in the case of
                 a single output. The reliability and speed of the
                 identification algorithm have been improved, and the
                 method has been made easier to use. Rather
                 sophisticated computer program employs a generalized
                 model structure, an improved hill-climbing algorithm,
                 and an automatic procedure for determining model orders
                 and transport delays. Some statistics are given from
                 performance tests of the program on various processes
                 in paper production.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1220 (Simulation, modelling and identification);
                 C6150Z (Other systems operation programs)",
  corpsource =   "IBM Nordic Lab., Lidingo, Sweden",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "algorithms; analysis; automatic control; computers,
                 programming; identification; programming; statistical
                 methods; subroutines",
}

@Article{Schwartz:1970:ACS,
  author =       "G. C. Schwartz and R. E. Jones",
  title =        "Argon Content of {SiO}$_2$ Films Deposited by {RF}
                 Sputtering in Argon",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "52--60",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When SiO$_2$ is deposited by sputtering in an argon RF
                 glow discharge, the films so produced contain
                 considerable amounts of trapped argon, as determined by
                 X-ray fluorescence analysis. This argon content was
                 measured as a function of various sputtering
                 parameters-argon pressure, RF power, electrode spacing,
                 substrate temperature, and magnetic field, the latter
                 two being most influential. A simple theoretical model
                 for the capture and release of argon is presented which
                 explains an observed linear decrease of the argon
                 concentration in SiO$_2$ with increasing temperature.
                 Incorporation of argon into the sputtered SiO$_2$ film
                 does not seem to impair the film's ability to act as a
                 food passivating and insulating layer.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A6860 (Physical properties of thin films,
                 nonelectronic)",
  corpsource =   "IBM Components Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "argon; electric insulating materials; films;
                 manufacture; physics; semiconductor devices; silicon
                 compounds; sorption; sputtering",
}

@Article{Esaki:1970:SND,
  author =       "L. Esaki and R. Tsu",
  title =        "Superlattice and Negative Differential Conductivity in
                 Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "61--65",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:31:11 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The theory is studied for a one-dimensional periodic
                 potential, or `superlattice,' in monocrystalline
                 semiconductors formed by a periodic variation of alloy
                 composition or of impurity density introduced during
                 epitaxial growth. If the period of a superlattice, of
                 the order of 100A, is shorter than the electron mean
                 free path, a series of narrow allowed and forbidden
                 bands is expected due to the subdivision of the
                 Brillouin zone into a series of minizones. If the
                 scattering time of electrons meets a threshold
                 condition, the combined effect of the narrow energy
                 band and the narrow wave-vector zone makes it possible
                 for electrons to be excited with moderate electric
                 fields to an energy and momentum beyond an inflection
                 point in the E-k relation; this results in a negative
                 differential conductance in the direction of the
                 superlattice.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electric properties; electrical conductivity;
                 electrical conductivity of solids; physics, solid
                 state; semiconductor materials; semiconductors",
}

@Article{Overmeyer:1970:CCD,
  author =       "J. Overmeyer",
  title =        "Calculation of the Current Density in the Contacts of
                 a Thin Film Resistor",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "66--69",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The two-dimensional boundary value problem appropriate
                 to current flow in a film resistor is examined. A
                 simple closed-form solution for current density into
                 the contact is found to exist for the important case of
                 a thin film resistor with extended lands. The spatial
                 dependence of the current density into the contact is
                 found to be similar to that obtained by Kennedy and
                 Murley for the diffused resistor, with film thickness
                 entering the functional dependence in a role analogous
                 to the diffusion length of the dopant ion in the
                 diffused resistor.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2120 (Resistors); B2180 (Electrical contacts)",
  corpsource =   "IBM Components Div. Lab., E. Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "current distribution; electric resistors; electrical
                 contacts; film devices; films; integrated circuits;
                 resistors; thin; thin film resistors",
}

@Article{Russell:1970:IAL,
  author =       "S. S. Russell and S. L. Levine",
  title =        "Indium-Mercury Alloy as a Low-Toxicity Liquid
                 Electrode",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "1",
  pages =        "70--71",
  month =        jan,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:11 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An alloy containing 2\% indium is recommended for use
                 as a liquid electrode in electronic manufacturing and
                 testing applications. Experimental studies show that
                 toxicity at 25 C can be substantially reduced by using
                 In-Hg alloys instead of pure Hg in the electrode bath.
                 Quite probably the vapor pressure would increase with
                 temperature, but it almost certainly would not exceed
                 the toxicity threshold at room temperatures normally
                 found in a laboratory or test facility. The long-term
                 toxicity is still a potential problem, and the alloy
                 does exhibit `hot spots' during electrical charging
                 that can produce mercury vapor. With suitable safety
                 precautions, however, there is low risk to the user.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering)",
  corpsource =   "IBM Components Div. Lab., E. Fishkill., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Research \& Development",
  keywords =     "electrodes; electronic; electronic equipment
                 manufacture; equipment testing; indium mercury alloys;
                 industrial hygiene; liquid electrodes; safety",
}

@Article{Drangeid:1970:DPS,
  author =       "K. E. Drangeid and R. S. Sommerhalder",
  title =        "Dynamic Performance of {Schottky-Barrier} Field Effect
                 Transistors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "82--94",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The dynamic performance is analyzed to determine the
                 physical parameters on which the dynamic properties of
                 a FET depend, how strongly they influence the dynamic
                 qualities of FET's, and what recommendations can be
                 given as to proper choice of material or structure for
                 FET's with good high-frequency performance. Plots of
                 source-to-gate impedance, gain-to-drain impedance,
                 source-to-drain impedance and transconductance are
                 shown for the cases where there was available
                 information on the d-c conditions at the operating
                 point. The main result is that lumped FET's need not be
                 slow compared to bipolar transistors.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "equivalent networks; erb; field effect; field effect
                 transistors; IBMJA; transistors; transistors, circuits;
                 transistors, models",
}

@Article{Kennedy:1970:CAT,
  author =       "D. P. Kennedy and R. R. O'Brien",
  title =        "Computer Aided Two-Dimensional Analysis of the
                 Junction Field-Effect Transistor",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "95--116",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A two-dimensional analysis is presented of the
                 mechanisms of operation for a junction field-effect
                 transistor. Particular emphasis is placed upon the
                 process of electric current saturation in both wide
                 gate and narrow gate structures. It is shown that
                 velocity saturated carrier transport in a source-drain
                 channel produces heretofore unreported mechanisms of
                 device operation. Comparisons made between the
                 conclusions derived from this two-dimensional analysis
                 and the conventional one-dimensional theory of junction
                 field-effect transistor operation are presented in
                 graphic form.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices); C7410B (Power
                 engineering computing)",
  corpsource =   "IBM Components Div. Lab., E. Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "computer applications; computers; electronics
                 applications of; field effect; field effect
                 transistors; IBMJA; operating mechanisms; transistors;
                 transistors, models; two-dimensional analysis",
}

@Article{Middelhoek:1970:PMT,
  author =       "S. Middelhoek",
  title =        "Projection Masking, Thin Photoresist Layers and
                 Interference Effects",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "117--124",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When projection masking is used for producing
                 microwave semiconductor devices, standing light waves
                 can occur in the SiO$_2$ and photoresist layers,
                 leading to unexpected effects. Some of these effects
                 are described, and the experimental conditions under
                 which satisfactory masking results can be obtained are
                 explained.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits)",
  corpsource =   "IBM Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "IBMJA; integrated circuit production; manufacture;
                 masks; optics; photography, industrial applic;
                 photoresist layers; projection masking; semiconductor
                 devices",
}

@Article{Wolf:1970:MPS,
  author =       "P. Wolf",
  title =        "Microwave Properties of {Schottky-Barrier}
                 Field-Effect Transistors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "125--141",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The microwave properties of silicon Schottky-barrier
                 field-effect transistors (MESFET's) with a gatelength
                 of 1 Um are investigated. The scattering parameters of
                 the transistors have been measured from 0.1 up to 12
                 GHz. From the measured data an equivalent circuit is
                 established which consists of an intrinsic transistor
                 and extrinsic elements. Some of the elements of the
                 intrinsic transistor, notably the transconductance, are
                 strongly influenced by the saturation of the drift
                 velocity. Best performance of the intrinsic transistor
                 is obtained with highly doped and thin channels. The
                 measured power-gain is in good agreement with
                 theoretical values deduced from the equivalent circuit.
                 The best device has a maximum frequency of oscillation
                 of 12 GHz. The investigation reveals that the extrinsic
                 elements, especially the resistance of the
                 gate-metallization, and the gate-pad parasticis,
                 degrade the power-gain considerably.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "equivalent circuits; field effect; field effect
                 transistors; IBMJA; transistors, circuits; transistors,
                 measurement; transistors, models",
}

@Article{Mohr:1970:SSP,
  author =       "Th. O. Mohr",
  title =        "Silicon and Silicon-Dioxide Processing for
                 High-Frequency {MESFET} Preparation",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "142--147",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Silicon wafer processing is described which provides
                 submicrometer epitaxial layers on top of
                 high-resistivity silicon substrates for fabrication of
                 high-frequency metal-semiconductor field-effect
                 transistors. Silicondioxide underetching at the border
                 of an oxide window, performed in hydrogen at elevated
                 temperatures, is one method of realizing 1-Um device
                 structures.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "field effect transistors; IBMJA; manufacture;
                 semiconductor device manufacture; silicon and alloys;
                 silicon compounds; transistors; transistors, field
                 effect",
}

@Article{Middelhoek:1970:MPF,
  author =       "S. Middelhoek",
  title =        "Metallization Processes in Fabrication of
                 {Schottky-Barrier FET}'s",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "148--151",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The metallization processes necessary for the
                 production of microwave Schottky-barrier field-effect
                 transistors are described. Since the gate contact is
                 only 1 Um wide, the holes and the metallization of the
                 source, drain and gate contacts are produced
                 simultaneously. Then in a subsequent process, the
                 source and drain contacts are converted to ohmic
                 contacts by the evaporation of Au-Sb onto these
                 contacts. Mask alignment is not a problem because the
                 Au-Sb spreads across the surface after suitable heat
                 treatment.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2560S (Other field effect devices)",
  corpsource =   "IBM Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "field effect transistors; IBMJA; manufacture;
                 metallizing; on; semiconductor device manufacture;
                 transistors, field effect",
}

@Article{Keyes:1970:MED,
  author =       "R. W. Keyes and R. Landauer",
  title =        "Minimal Energy Dissipation in Logic",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "152--157",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Minimal energy dissipations for the logic process
                 based on thermodynamics and general phase space
                 considerations are known. The actual availability of
                 these minimal dissipations has not, however, been
                 demonstrated. Thise minimal dissipation sources in a
                 computing system also act as noise sources and thereby
                 lead to questions about the ultimate available
                 reliability of the computing process. A new and
                 hypothetical device is presented in this paper and used
                 to construct a physically analyzable computing system.
                 It is demonstrated that this system has dissipations
                 larger than, but of the same order of magnitude as, the
                 original minimal quantities. It is also shown that any
                 required reliability can be obtained with this device,
                 without increased energy expenditure, but at the
                 expense of an increasing time per computational step.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210 (Logic design methods)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "automata theory; computers, reliability; IBMJA;
                 information theory; logic design; statistical
                 mechanics",
}

@Article{Keyes:1970:TPP,
  author =       "R. W. Keyes",
  title =        "Thermal Problems of the Pulsed Injection Laser",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "158--167",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Heat is produced in short periods of time during
                 pulsed operation of an injection laser. The temperature
                 of the laser at the beginning of any pulse due to the
                 heating caused by preceding pulses is calculated for
                 several simple model cases. The results are applied in
                 the description of performance deterioration caused by
                 heating.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255P (Lasing action in semiconductors); A4260 (Laser
                 systems and laser beam applications); B4320J
                 (Semiconductor lasers)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "analysis; IBMJA; lasers; lasers, semiconductor; niz;
                 semiconductor devices, thermal; semiconductor lasers",
}

@Article{Koenig:1970:ARD,
  author =       "H. R. Koenig and L. I. Maissel",
  title =        "Application of {RF} Discharges to Sputtering",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "168--171",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The operation of RF discharges is described and the
                 internal distribution of voltages is considered. The
                 significance of this with respect to sputtering,
                 particularly of insulators, is then discussed. An
                 equivalent circuit for the discharge is presented and
                 the influence of such parameters as pressure and
                 magnetic field on the components of this circuit is
                 described. Finally, energy distributions for positive
                 ions, electrons, and negative ions incident at the
                 substrate during deposition are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5280 (Electric discharges); A6180 (Radiation damage
                 and other irradiation effects); A6800 (Surfaces and
                 interfaces; thin films and whiskers); B0500 (Materials
                 science for electrical and electronic engineering);
                 B2315 (Gas discharges); B2810D (Dielectric breakdown
                 and discharges); B2810 (Dielectric materials and
                 properties)",
  corpsource =   "IBM Components Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "discharges (electric); films; films, dielectric;
                 IBMJA; ionization; plasmas; preparation; radio
                 equipment, manufacture; sputtering",
}

@Article{Logan:1970:CRS,
  author =       "J. S. Logan",
  title =        "Control of {RF} Sputtered Film Properties Through
                 Substrate Tuning",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "172--175",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A means has been found to control the RF potential of
                 the substrate during RF sputtering. The application of
                 this technique to the deposition of silica films has
                 been investigated in detail. The technique can be
                 described as the use of an adjustable RF impedance
                 between the substrate holder and ground electrodes,
                 which generates an RF potential by virtue of the flow
                 of RF current through it. Adjustment of the RF
                 potential of the substrate results in a controlled d-c
                 bias potential developed at the film surface, which
                 correlates directly with the physical properties of the
                 deposited films. In general, the most desirable film
                 properties are obtained when the d-c substrate bias
                 (obtained by adjusting the substrate-holder RF
                 impedance) is at a high negative potential. The effect
                 of substrate bias on etch rate, pinhole breakup
                 thickness, and argon content has been measured.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6800 (Surfaces and interfaces; thin films and
                 whiskers); B0500 (Materials science for electrical and
                 electronic engineering); B2830 (Insulation and
                 insulating coatings); B7310J (Impedance and admittance
                 measurement); C3110J (Impedance and admittance
                 control); C3355Z (Control applications in other
                 manufacturing processes)",
  corpsource =   "IBM Components Div. Lab., Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric variables control; films; films, dielectric;
                 IBMJA; ionization; manufacturing processes; plasmas;
                 preparation; radio equipment, manufacture; radio
                 frequency sputtering; sputtering; thin films",
}

@Article{Maissel:1970:RSS,
  author =       "L. I. Maissel and R. E. Jones and C. L. Standley",
  title =        "Re-Emission of Sputtered {SiO}$_2$ During Growth and
                 its Relation to Film Quality",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "176--181",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:14 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An improved technique for measuring re-emission
                 coefficients is described and data on the effect of
                 temperature are presented. These are discussed in the
                 light of a physical model of film growth during
                 sputtering wherein constant re-emission of material
                 throughout deposition occurs. Evidence is then
                 presented that such re-emission is essential if films
                 of high quality are to be obtained. To help assess
                 `quality' in a quantitative fashion, use has been made
                 of the PBUT (pin-hole-breakup thickness) phenomenon,
                 which is described in some detail. The influence on
                 PBUT of several system parameters such as sputtering
                 pressure and impurity content is discussed and related
                 to the re-emission coefficient.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180 (Radiation damage and other irradiation
                 effects); A6870 (Whiskers and dendrites: growth,
                 structure, and nonelectronic properties); B2830E
                 (Inorganic insulation)",
  corpsource =   "IBM Components Div. Lab., E. Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "films; films, dielectric; films, electric properties;
                 IBMJA; insulating materials; N E; plasmas; preparation;
                 radio equipment, manufacture; silicon compounds;
                 sputtering; thin films",
}

@Article{Logan:1970:MEC,
  author =       "J. S. Logan and F. S. Maddocks and P. D. Davidse",
  title =        "Metal Edge Coverage and Control of Charge Accumulation
                 in {RF} Sputtered Insulators",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "182--191",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The successful application of RF sputtered SiO$_2$ in
                 the passivation of silicon semiconductor devices
                 depends in part on the proper control of ionic charge
                 migration in the insulator during sputtering, and on
                 the adequate coverage of metal line edges by the
                 insulator. It is shown that an appropriate combination
                 of target purity, substrate temperature control and
                 phosphosilicate blocking layer thickness can be used to
                 achieve ionic charge densities at the silicon-SiO$_2$
                 interface of less than 1x10//1$_2$ charges per sq cm.
                 The effects of argon ion bombardment are shown to be
                 acceptably low for typical operating conditions. In a
                 conventional system, the adequate coverage of metal
                 line edges is shown to be influenced primarily by argon
                 pressure and magnetic field. In a special system where
                 the substrate potential can be varied, it has been
                 shown that adequate edge coverage can be obtained at
                 sufficiently negative potentials. These data are
                 consistent with a mechanism requiring some resputtering
                 to obtain the desired film coverage.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6870 (Whiskers and dendrites: growth, structure, and
                 nonelectronic properties); A7700 (Dielectric properties
                 and materials); B2830 (Insulation and insulating
                 coatings)",
  corpsource =   "IBM Components Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "films; films, dielectric; films, electric properties;
                 IBMJA; insulating coatings; plasmas; preparation; radio
                 equipment, manufacture; silicon compounds; thin films",
}

@Article{Mazza:1970:AIM,
  author =       "N. M. Mazza",
  title =        "Automatic Impedance Matching System for {RF}
                 Sputtering",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "2",
  pages =        "192--193",
  month =        mar,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:16 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A matching network transforms the complex impedance of
                 a sputtering system to a purely resistive value. A
                 method is given for preventing increases in the
                 reflected power as the impedance in the sputtering
                 system changes. After starting with the sputtering
                 system properly matched and operating, the capacitors
                 in the matching network are adjusted to obtain
                 representative combinations of capacitance that are
                 near the `matched values'. A block diagram of the
                 entire matching system is shown. The automatic matching
                 system has, by eliminating a troublesome variable,
                 proved useful in the improvement of the overall RF
                 sputtering process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0500 (Materials science for electrical and electronic
                 engineering); C3355Z (Control applications in other
                 manufacturing processes)",
  corpsource =   "IBM Components Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "discharges (electric); films, preparation; IBMJA;
                 manufacture; manufacturing processes; radio circuits;
                 radio equipment; radio frequency sputtering;
                 sputtering",
}

@Article{Methfessel:1970:SFM,
  author =       "S. Methfessel",
  title =        "Survey of the Field of Magnetic Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "207--213",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Magnetic semiconductors are materials with good band
                 conductivity as well as magnetic order. Since each
                 phenomenon requires a different description of the
                 relevant electron states, the band structure of these
                 materials is very complicated, containing band states
                 as well as localized states. An important condition for
                 strong interaction between the magnetic and the
                 conducting electrons appears to be the existence of
                 high densities of states at the Fermi energy, providing
                 large carrier polarizations in the magnetized state.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7000 (Condensed matter: electronic structure,
                 electrical, magnetic, and optical properties); A7220
                 (Electrical conductivity phenomena in semiconductors
                 and insulators); B2550 (Semiconductor device
                 technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Ruhr-Univ., Bochum, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "band structure; IBMJA; impurity electron states and
                 effects; magnetisation; magnetisation state; magnetism;
                 materials; physics; reviews; RON; semiconductor;
                 semiconductors; solid state",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Kasuya:1970:EME,
  author =       "T. Kasuya",
  title =        "Exchange Mechanisms in Europium Chalcogenides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "214--223",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Superexchange mechanisms, which are mostly responsible
                 for the nnn exchange constant I$_2$ in Eu
                 chalcogenides, are investigated in detail. In contrast
                 with the usual 3d transition metal compounds, the
                 Kramers-Anderson mechanism is estimated to be one order
                 of magnitude too small to explain the experimental
                 results. The mechanism by which a p electron is
                 transferred to a 5d state through the d-f exchange
                 interaction gives the correct order f magnitude for
                 I$_2$, with a negative sign, even though it is a
                 sixth-order perturbation. The cross term between the
                 above two mechanisms is shown to be nearly as important
                 as the second mechanism and may have a positive sign.
                 The indirect exchange mechanisms, in which the anion p
                 level has no important role, are responsible for the nn
                 exchange constant I$_1$. The phonon-assisted mechanism
                 proposed by J. Smit is estimated to be more than one
                 order of magnitude smaller than the experimental value.
                 The d-f mixing term is proved to be responsible for
                 I$_1$, in good agreement with experiment.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7510 (General theory and models of magnetic
                 ordering); A7530E (Exchange and superexchange
                 interactions in magnetically ordered materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "europium compounds; exchange interactions (electron);
                 IBMJA; magnetism; physics; rare earth compounds; solid
                 state",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Kuznietz:1970:LMI,
  author =       "M. Kuznietz",
  title =        "Long-Range Magnetic Interactions ({RKKY}-Type) in the
                 {UP-US} Solid Solutions",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "224--226",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A neutron diffraction study of the UP-US solid
                 solutions has revealed two new magnetic structures, the
                 type IA (2U, 2-) antiferromagnetic structure and the
                 antiphase (5U, 4-) ferrimagnetic structure, which are
                 of long range (several lattice parameters) and are
                 typical of long-range RKKY-type interactions, as
                 assumed in the simple model for these compounds.
                 Further experimental evidence is given for the
                 long-range magnetic interactions in uranium
                 monopnictides and monochalcogenides and their solid
                 solutions. The situation in these uranium compounds is
                 compared with the corresponding lanthanide compounds,
                 and the role of covalency and superexchange in the case
                 of heavier anions is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7530E (Exchange and superexchange interactions in
                 magnetically ordered materials); A7550E
                 (Antiferromagnetics)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Argonne Nat. Lab., IL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "exchange interactions (electron); IBMJA; magnetic
                 properties of; magnetism; physics; solid state;
                 substances; uranium compounds",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Hastings:1970:OMN,
  author =       "J. M. Hastings and L. M. Corliss",
  title =        "Ordered Moment of {NiS}$_2$",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "227--228",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The transition metal dichalcogenides exhibit a wide
                 variety of both electrical and magnetic properties,
                 from insulators to superconductors and from
                 ferromagnetism through antiferromagnetism to
                 diamagnetism. NiS$_2$ is a semiconductor with an
                 anomalous paramagnetic behavior which leaves in doubt
                 the existence of a local moment. Previous neutron
                 diffraction data have failed to show any ordering down
                 to 4.2 K. Neutron powder diffraction data on
                 stoichiometric NiS$_2$ are presented which show a
                 transition at 40 K to a structure which can be
                 described as ordering of the first kind. This is
                 followed by an abrupt transition at 30 K in which
                 additional diffraction peaks appear and these are
                 consistent with ordering of the second kind. Despite
                 the fact that the powder data cannot indicate an
                 unambiguous magnetic structure, the magnitude of the
                 ordered moment can be fixed. The rms moments associated
                 with ordering of the first and second kinds are given,
                 as is the total moment.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7500 (Magnetic properties and materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "IBMJA; magnetic properties of substances; magnetic
                 transitions of; magnetism; neutron diffraction
                 examination of materials; nickel compounds; physics;
                 rd; solid state; substances",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Mathur:1970:SHS,
  author =       "M. P. Mathur and D. W. Deis and C. K. Jones and A.
                 Patterson and W. J. {Carr, Jr.}",
  title =        "Specific Heat of {SnTe-MnTe} System from $2$ to
                 $25^{\circ}{K}$",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "229--231",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The low-temperature specific heat of a series of
                 semiconductor alloys of the SnTe-MnTe system, for Mn to
                 Sn ratios of 0 to 0.1, has been measured in the
                 temperature range 2 to 25 K. Large anomalies are
                 observed due, presumably, to the ordering of the Mn
                 spin system. The temperature region over which these
                 anomalies occur is roughly the region in which
                 ferromagnetism is observed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6540 (Heat capacities of solids)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Westinghouse Res. Labs., Pittsburgh, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "Al; HEV; IBMJA; magnetic properties; magnetisation
                 state; manganese compounds; materials; physics, solid
                 state; semiconductor; semiconductors; semiconductors,
                 manganese comp; semiconductors, tellurium comp;
                 specific heat of solids; tin compounds",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Honig:1970:LIE,
  author =       "J. M. Honig",
  title =        "Localized and Itinerant Electrons in Oxides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "232--244",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recent work concerning the electrical properties of
                 ReO$_3$, nonstoichiometric praseodymia, TiO$_2$,
                 SrTiO$_3$, perovskites, CrO$_2$, NiO, mixed oxides of
                 LiZnV, V$_2$O$_3$, and Ti$_2$O$_3$ has been selectively
                 reviewed in attempts to elucidate the conduction
                 properties of the charge carriers. A number of
                 controversial issues are pointed out-frequently it is
                 not known whether mobilities are activated or not, nor
                 whether a given material should be classified as a
                 polaronic or mixed-carrier material; neither is there
                 agreement on the nature of electrical transitions.
                 Reasons for discrepancies in electrical properties are
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7210D (Carrier scattering by phonons, magnons, and
                 other nonlocalized excitations)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Purdue Univ., West Lafayette, IN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electrical conductivity of solids; IBMJA; oxygen
                 compounds; physics; RES; reviews; solid state",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Siemons:1970:HMM,
  author =       "W. J. Siemons",
  title =        "Hall Mobility Measurements on Magnetite Above and
                 Below the Electronic Ordering Temperature",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "245--247",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Hall effect measurements were made on a single crystal
                 of magnetite in the temperature range 65 to 373 K. The
                 Hall voltage was positive over the whole temperature
                 range. The results can be explained by assuming that
                 magnetite is a normal semiconductor below the
                 transition point and a degenerate one above that
                 temperature.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220M (Galvanomagnetic and other magnetotransport
                 effects (semiconductors/insulators)); A7280
                 (Conductivity of specific semiconductors and
                 insulators); A7560E (Magnetization curves, hysteresis,
                 Barkhausen and related effects); B2550 (Semiconductor
                 device technology); B3110 (Magnetic materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "E. I. du Pont de Nemours Co., Wilmington, DE, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric properties; electrical conductivity of
                 solids; Hall effect; IBMJA; iron oxide; magnetic;
                 magnetisation state; materials; physics, solid state;
                 semiconductor materials; semiconductors; WO",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Nicolau:1970:TPI,
  author =       "P. Nicolau and I. Bunget and M. Rosenberg and I.
                 Belciu",
  title =        "Transport Properties of Iron-Nickel Ferrites",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "248--250",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The mechanism of electrical conduction in iron-nickel
                 ferrites was investigated. The electrical properties of
                 these compounds are extremely sensitive to the presence
                 of alpha-Fe$_2$O$_3$ as a second phase. The exponential
                 temperature dependence of the electrical resistivity
                 and the temperature-independent thermoelectric power
                 are in good agreement with an electron-hopping model.
                 The electrical conduction occurs by thermally activated
                 electron hopping between octahedral ferrous and ferric
                 ions with an activation energy q. The values of
                 resistivity, q and thermoelectric power depend on the
                 ferrous ion concentration only, and are not sensitive
                 to small deviations from stiochiometry due to the
                 presence of cation or anion vacancies.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); A7550G
                 (Ferrimagnetics); B2550 (Semiconductor device
                 technology); B3110E (Ferrites and garnets)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Univ. Bucharest, Romania",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric properties; electrical conductivity;
                 electrical conductivity of solids; ferrites; IBMJA;
                 magnetic materials, ferrites; nickel compounds;
                 physics, solid state; semiconductor materials;
                 semiconductors",
  sponsororg =   "American Phys. Soc.; IBM Corp",
  xxauthor =     "P. Nicollau and I. Bunget and M. Rosenberg and I.
                 Belciu",
}

@Article{Rice:1970:MTT,
  author =       "T. M. Rice and D. B. McWhan",
  title =        "Metal-Insulator Transition in Transition Metal
                 Oxides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "251--257",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The metal-insulator transition in the V$_2$O$_3$
                 system is discussed. A recent series of experiments on
                 V$_2$O$_3$ and Cr-doped V$_2$O$_3$ is reviewed. The
                 phase diagram for the system is described. The Cr-doped
                 mixed oxides are insulating at room temperature and
                 transform to a metal with the application of pressure.
                 This phase transition is identified as a N. F. Mott
                 transition. A comparison is made between the
                 experimental results and theoretical predictions of the
                 Mott transition.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electrical conductivity; electrical conductivity of
                 solids; IBMJA; physics; semiconductor materials;
                 semiconductors, electric properties; solid state;
                 vanadium compounds",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Matsumoto:1970:MEP,
  author =       "G. Matsumoto",
  title =        "Magnetic and electrical properties of
                 {(La$_{1-x}$Ca$_x$)MnO$_3$}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "258--260",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Samples of polycrystalline Ca-doped LaMnO$_3$ with
                 varying proportions of Ca were studied experimentally.
                 Data were obtained for the Neel temperature,
                 paramagnetic Curie temperature, and NMR spectra
                 associated with Mn ions. All the experimental results
                 could be qualitatively explained by postulating that
                 the d holes at the sites around Ca ions contribute to
                 both the electrical conduction and the magnetic
                 interaction. The ferromagnetic interaction induced by
                 mobile d holes cannot be ascribed to the
                 double-exchange interaction, if this interaction has
                 the usual form.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); A7530K
                 (Magnetic phase boundaries)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Univ. Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electrical conductivity; electrical conductivity of
                 solids; IBMJA; lanthanum compounds; magnetic materials;
                 magnetic properties; magnetic relaxation; magnetic
                 transitions of; materials; NCr; nuclear magnetic
                 resonance; of substances; physics; semiconductor;
                 semiconductors, electric properties; semiconductors,
                 magnetic properties; semiconductors, manganese comp;
                 substances",
  sponsororg =   "American Phys. Soc.; IBM Corp",
  xxtitle =      "Magnetic and Electrical Properties of {Ca}-Doped
                 {LaMnO}$_3$",
}

@Article{Adler:1970:BSM,
  author =       "D. Adler",
  title =        "Band Structure of Magnetic Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "261--268",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The band structure of materials in which both
                 localized and itinerant outer electrons are
                 simultaneously present is discussed. The Franck-Condon
                 principle is applied, and small and large polaron
                 formation is taken into account. A scheme for
                 estimating the densities-of-states of perfect crystals
                 and doped or nonstoichiometric crystals is suggested,
                 based on the ionic many-body states as a starting
                 point. Screening, covalency, crystalline-field and
                 overlap effects are quantitatively considered. In
                 particular, the band structures of both pure and
                 Li-doped NiO are derived and found to be in agreement
                 with the experimental observations. It is shown that
                 conclusions which are based on ordinary donor and
                 acceptor techniques fail to account for the effects of
                 doping even in a qualitatively correct manner, due to
                 the neglect of important correlation effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "MIT., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "band structure; IBMJA; magnetic properties; nickel
                 compounds; physics, solid state; semiconductor
                 materials",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{vonMolnar:1970:TPE,
  author =       "S. {Von Molnar}",
  title =        "Transport Properties of the Europium Chalcogenides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "269--275",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Transport properties of pure and doped Eu
                 chalcogenides are reviewed to determine the mechanisms
                 responsible for the anomalous behavior near the Curie
                 temperature. It is found that, whereas the scattering
                 theory of simple metals accounts for the behavior of
                 materials containing impurities in excess of
                 2x10$^{20}$cm-$_3$, several models for transport have
                 been proposed for smaller concentrations. The impurity
                 hopping model appears to be consistent with the data
                 for very dilute systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); A7560E
                 (Magnetization curves, hysteresis, Barkhausen and
                 related effects); B2550 (Semiconductor device
                 technology); B3110 (Magnetic materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric properties; electrical conductivity of
                 solids; europium compounds; IBMJA; impurity electron
                 states and effects; magnetic materials; magnetic
                 transitions of substances; physics, solid state;
                 semiconductor materials; semiconductors",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Oliver:1970:TMF,
  author =       "M. R. Oliver and J. O. Dimmock and T. B. Reed",
  title =        "Temperature and Magnetic Field Dependence of the
                 Conductivity of {EuO}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "276--278",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The conductivity of EuO has been measured as a
                 function of temperature from 30 to 300 K in magnetic
                 fields up to 50 kG. The zero-field resistivity exhibits
                 a sharp elbow at about 50 K, and increases as much as
                 $10^8$ between 50 and 70 K to a broad maximum between
                 75 and 80 K. In an applied magnetic field, the broad
                 maximum is rapidly decreased the elbow is shifted to
                 higher temperatures. These data are interpreted in
                 terms of a transfer of electrons between a conduction
                 band and an electron trap. In the model the energy
                 separation between the band and trap level depends on
                 the magnetic energy of the crystal and is thus a strong
                 function of temperature and magnetic field. At low
                 temperatures the trap level is assumed to be above the
                 conduction band edge such that the electrons lie in the
                 band. As the temperature is increased the energy of the
                 band edge increases such that it crosses the trap level
                 at about 50 K. The large increase in resistivity with
                 increasing temperature and the effects due to the
                 magnetic field are explained by the transfer of
                 electrons from the energy band into the trap states.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); B2550
                 (Semiconductor device technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "MIT., Lexington, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "BER; electric properties; electrical conductivity;
                 electrical conductivity of solids; europium compounds;
                 IBMJA; physics, solid state; semiconductor materials;
                 semiconductors",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Thompson:1970:TSF,
  author =       "W. A. Thompson and F. Holtzberg and S. {von Molnar}",
  title =        "Tunneling Spectroscopy in Ferromagnetic
                 Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "279--281",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The observation of zero-bias anomalies in tunneling
                 has received much attention but their interpretation
                 has suffered from a lack of definition of the character
                 of the tunneling barrier. Junctions formed from a metal
                 with Eu-chalcogenide ferromagnetic semiconductors offer
                 a potential means of overcoming this difficulty.
                 Rectifying junctions of EuS\slash Eu on In were
                 prepared. The results indicate a large resistivity peak
                 at zero-bias voltage which, in the ferromagnetic
                 region, has a strong magnetic-field dependence, and a
                 resistance maximum near 30 mv which has been
                 tentatively assigned to excitation of collective modes
                 in the bulk of the semiconductor. The results are
                 interpreted by considering excitation of ferromagnetic
                 magnons in the barrier region.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7560E (Magnetization
                 curves, hysteresis, Barkhausen and related effects);
                 B2560H (Junction and barrier diodes); B3110C
                 (Ferromagnetic materials); B3110 (Magnetic materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "ATA; dielectric phenomena; electric properties;
                 electrical conductivity of solids; europium compounds;
                 ferromagnetic properties of substances; IBMJA; magnetic
                 materials; materials; physics, solid state;
                 semiconductor; semiconductor junctions; tunnelling",
  sponsororg =   "American Phys. Soc.; IBM Corp",
  xxtitle =      "Tunnelling spectroscopy in ferromagnetic
                 semiconductors",
}

@Article{Haas:1970:SSB,
  author =       "C. Haas",
  title =        "Spin-disorder scattering and band structure of the
                 ferromagnetic chalcogenide spinels",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "282--288",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Magnetic semiconductors are characterized by the
                 presence of charge carriers and magnetic moments. The
                 interaction between the charge carriers and the
                 magnetic moments leads to a spin splitting of the
                 energy bands, and to spin-disorder scattering of the
                 scattering of the charge carriers. The result is a
                 strong influence of magnetic properties on the
                 transport properties. The theory of these effects is
                 discussed, and two models for the band structure of
                 CdCr$_2$Se$_4$ are discussed, and compared with
                 experimental data on the optical properties and the
                 transport properties.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); A7510 (General
                 theory and models of magnetic ordering); B2550
                 (Semiconductor device technology); B3110C
                 (Ferromagnetic materials); B3110 (Magnetic materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "State Univ., Groningen, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "band structure; cadmium compounds; electrical
                 conductivity; ferromagnetic properties of substances;
                 IBMJA; magnetic; materials; of solids; physics;
                 semiconductor materials; semiconductors, electric
                 properties.; semiconductors, intermetallic;
                 semiconductors, magnetic; solid state",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Friedman:1970:HEB,
  author =       "L. R. Friedman and A. Amith",
  title =        "Hole and electron bands in $n$-type {CdCr$_2$\slash
                 Se$_4$}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "289--291",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B2550 (Semiconductor
                 device technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "RCA, Princeton, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "band structure; cadmium compounds; semiconductor
                 materials",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Vural:1970:HFN,
  author =       "B. Vural",
  title =        "High-field nonohmic behavior of the $p$-type
                 ferromagnetic semiconductor {Ag$_x$\slash
                 Cd$_{1-x}$\slash Cr$_2$\slash Se$_4$}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "292--294",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:21 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The high-field longitudinal magnetoresistance of the
                 ferromagnetic (polycrystalline) p-type semiconductor
                 CdCr$_2$Se$_4$ doped with 1\% Ag has been measured as a
                 function of temperature and applied magnetic and
                 electric fields. It is suggested that the observed
                 `anomalies' may be related to the possible spin
                 wavecarrier wave interactions in these materials.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220M (Galvanomagnetic and other magnetotransport
                 effects (semiconductors/insulators)); A7280
                 (Conductivity of specific semiconductors and
                 insulators); A7560E (Magnetization curves, hysteresis,
                 Barkhausen and related effects); B2550 (Semiconductor
                 device technology); B3110C (Ferromagnetic materials);
                 B3110 (Magnetic materials)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "The City Coll. City Univ., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric properties; ferromagnetic properties of
                 substances; IBMJA; magnetic materials; magnetoelectric
                 effects; magnetoresistance; materials; pes; physics,
                 solid state; semiconductor; semiconductors;
                 semiconductors, intermetallic; semiconductors, magnetic
                 properties",
  sponsororg =   "American Phys. Soc.; IBM Corp",
  xxtitle =      "High-Field Nonohmic Behavior of the {P}-Type
                 Ferromagnetic Semiconductor {Ag}-Doped
                 {CdCr}$_2${Se}$_4$",
}

@Article{Frederikse:1970:CET,
  author =       "H. P. R. Frederikse",
  title =        "Comments on Electronic Transport in Transition Metal
                 Oxides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "295--300",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Several aspects of electronic transport in nonmagnetic
                 and magnetic transition metal oxides are reviewed.
                 These include high-and low-temperature measurements of
                 conductivity, the Hall effect and the Seebeck effects,
                 and their analysis in terms of the electronic energy
                 structure. Particular emphasis is put on the
                 temperature dependence of the Hall mobility, which
                 gives essential information concerning the correct
                 description of the energy states and the scattering of
                 the charge carriers. The relation between the transport
                 properties and the magnetic ordering is discussed. The
                 properties of LaCoO$_3$, together with an
                 interpretation suggested by J. B. Goodenough are
                 presented to illustrate this point.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220M (Galvanomagnetic and other magnetotransport
                 effects (semiconductors/insulators)); A7280
                 (Conductivity of specific semiconductors and
                 insulators); B2550 (Semiconductor device technology)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "Nat. Bur. Stand., Washington, DC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "electric properties; electrical conductivity;
                 electrical conductivity of solids; electron mobility;
                 Hall effect; IBMJA; materials; physics, solid state; R
                 W; reviews; semiconductor; semiconductors;
                 semiconductors, intermetallic",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Dimmock:1970:OPE,
  author =       "J. O. Dimmock",
  title =        "Optical Properties of the Europium Chalcogenides",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "301--308",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The measured optical properties of the Eu
                 chalcogenides are surveyed in an attempt to determine
                 those aspects of the electronic structure of these
                 materials that have been established. Optical
                 absorption as well as optical and magneto-optical
                 reflectivity data are discussed, along with the results
                 of photoconductivity, photoluminescence and
                 photoemission measurements and of magneto-optical
                 measurements in the vicinity of the absorption edge.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7800 (Optical properties and condensed matter
                 spectroscopy and other interactions of matter with
                 particles and radiation)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  corpsource =   "M.I.T., Lexington, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "absorption; band structure; europium compounds;
                 excitons; IBMJA; light; luminescence of inorganic
                 solids; magneto-; optical effects; optical properties;
                 optics; photoconductivity; physics, solid state;
                 reflectivity; reviews; semiconductor materials;
                 semiconductors; spectra of inorganic solids",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Pidgeon:1970:ORS,
  author =       "C. R. Pidgeon and J. Feinleib and W. J. Scouler and J.
                 O. Dimmock and T. B. Reed",
  title =        "Optical Reflectance Study of Magnetic Ordering Effects
                 in {EuO}, {EuS}, {EuSe} and {EuTe}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "309--311",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:29:09 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The reflectivity of the ferromagnetic semiconductors
                 EuO, EuS and EuSe has been measured as a function of
                 temperature and light polarization in an orienting
                 magnetic field. In the energy range from just above the
                 absorption edges to about 5.0 eV, there are two
                 prominent features, E$_1$ and E$_2$, which change with
                 the magnetic order, indicating exchange splittings of
                 the 5d states. Antiferromagnetic EuTe shows a different
                 structure in the E$_1$ and E$_2$ peaks. However, with a
                 large magnetic field applied, greater than 40 koe, the
                 spectrum becomes characteristic of the other
                 ferromagnetic europium chalcogenides suggesting a phase
                 transition to parallel spin alignment at a magnetic
                 field of approximately 80 koe. The effect provides
                 direct experimental confirmation of the band theory
                 prediction that there are superlattice splittings in
                 the band structure of an antiferromagnetic crystal.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7525 (Spin arrangements in magnetically ordered
                 materials); A7800 (Optical properties and condensed
                 matter spectroscopy and other interactions of matter
                 with particles and radiation)",
  corpsource =   "M.I.T., Lexington, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "band structure; crystals, structure; EuO; europium
                 compounds; ferromagnetic properties; IBMJA; magnetic
                 properties; of substances; physics, solid state;
                 reflectivity; semiconductor materials; semiconductors,
                 optical proper; spectra of inorganic solids",
}

@Article{Wittekoek:1970:MIB,
  author =       "S. Wittekoek and P. F. Bongers",
  title =        "Magneto-Optical Investigation of the Band Edge of
                 {CdCr}$_2${S}$_4$ and Related Absorption Measurements
                 on {Cr}-Doped {CdIn}$_2${S}$_4$",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "312--314",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The T$_1$ and T$_2$ crystal-field transitions of
                 trivalent Cr have been observed in the absorption
                 spectrum of CdIn$_2$S$_4$ (Cr). From the similarity
                 between the temperature dependence of the T$_2$ band
                 and the reported blue shift of the absorption edge of
                 CdCr$_2$S$_4$ it is concluded that in CdCr$_2$S$_4$
                 this edge is caused by the T$_2$ absorption band of the
                 chromic ions. The polar magneto-optic Kerr effect
                 between 560 and 700 nm and the Faraday rotation between
                 800 and 8000 nm are reported for CdCr$_2$S$_4$. The
                 Kerr effect spectrum indicates that the intrinsic band
                 edge of CdCr$_2$S$_4$ is at 1.91 e V at 60 K and shifts
                 to lower energies with decreasing temperature.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7800 (Optical properties and condensed matter
                 spectroscopy and other interactions of matter with
                 particles and radiation); A7820L (Magneto-optical
                 effects (condensed matter))",
  corpsource =   "Philips Res. Labs., Eindhoven, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "cadmium compounds; effects; IBMJA; light absorption;
                 magneto-optical; optical properties; semiconductor
                 materials; semiconductors; solids; spectra of
                 inorganic",
}

@Article{Kuse:1970:IMO,
  author =       "D. Kuse",
  title =        "Influence of Magnetic Ordering on the {Faraday} Effect
                 in {CdCr}$_2${Se}$_4$",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "315--317",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements of the magnetooptical rotation in
                 CdCr$_2$Se$_4$ at wavelengths between 0.9 and 1.3 $\mu$
                 m are reported. In the paramagnetic state, the rotation
                 passes a minimum with decreasing wavelength and changes
                 sign at the absorption edge. The Verdet constant is
                 proportional to the paramagnetic susceptibility (V
                 equals -18 deg/K Oe-cm at 300 K and the wavelength
                 equals 1.05 $\mu$ m). In the ferromagnetic state the
                 Faraday effect is large and the sign reversal very
                 pronounced; e.g., the rotation changes by 6500
                 deg\slash cm in a wavelength interval of 400 A in
                 saturated material at 93 K. The photon energy at which
                 the sign reversal occurs shows a strong
                 temperature-dependent red shift; the temperature
                 dependence is similar to that of the absorption edge.
                 At low temperatures an additional rotational minimum
                 appears that is subject to the same red shift.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7520 (Diamagnetism and paramagnetism); A7560E
                 (Magnetization curves, hysteresis, Barkhausen and
                 related effects); A7820L (Magneto-optical effects
                 (condensed matter))",
  corpsource =   "Brown Boveri Res. Center, Baden, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "cadmium compounds; ferromagnetic properties of
                 substances; IBMJA; magneto-optical effects; optical
                 properties; paramagnetic properties of; physics, solid
                 state; semiconductor materials; semiconductors;
                 semiconductors, intermetallic; semiconductors, magnetic
                 properties; substances",
}

@Article{White:1970:MFD,
  author =       "R. M. White",
  title =        "Magnetic Field Dependence of Indirect Transitions in
                 Ferromagnetic Semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "318--320",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The optical absorption coefficient for magnetic
                 semiconductors has been calculated for indirect
                 transitions in which the intraband scattering arises
                 from an s-d or s-f exchange interaction instead of the
                 usual phonon mechanism. The temperature and magnetic
                 field dependence of the resulting absorption
                 coefficient are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7530E (Exchange and
                 superexchange interactions in magnetically ordered
                 materials); A7560E (Magnetization curves, hysteresis,
                 Barkhausen and related effects); A7800 (Optical
                 properties and condensed matter spectroscopy and other
                 interactions of matter with particles and radiation)",
  corpsource =   "Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "exchange interactions (electron); ferromagnetic
                 properties; IBMJA; light absorption; magnetisation
                 state; of substances; optical properties; physics,
                 solid state; semiconductor materials; spectra of
                 inorganic solids",
}

@Article{Gyorgy:1970:PME,
  author =       "E. M. Gyorgy and J. F. {Dillon, Jr.} and J. P.
                 Remeika",
  title =        "Photoinduced magnetic effects in {YIG(Si)}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "321--329",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recent investigations of photoinduced effects in
                 magnetic materials are summarized. To date it has been
                 shown that the uniaxial anisotropy strain, linear
                 dichroism, coercive force and initial permeability can
                 be modified by infrared radiation. The theory
                 interpreting the coercive force and permeability
                 experiments differs from the model used to describe the
                 first three effects and is not discussed here. The
                 first three effects can be interpreted fairly well in
                 terms of a model which has single ferrous ions
                 preferentially occupying inequivalent octahedral sites.
                 It is shown that with polarized light, more than half
                 of the available ferrous ions can be selectively moved
                 among specific types of sites. Irradiation with
                 unpolarized light essentially leads to a distribution
                 appropriate for thermal equilibrium at the temperature
                 of the sample.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7240 (Photoconduction and photovoltaic effects;
                 photodielectric effects); A7560E (Magnetization curves,
                 hysteresis, Barkhausen and related effects)",
  corpsource =   "Bell Telephone Labs. Inc., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "ferromagnetic properties of substances; garnets;
                 magnetic; photoelectromagnetic effects; yttrium
                 compounds",
}

@Article{Kobayashi:1970:CSR,
  author =       "H. Kobayashi",
  title =        "Coding Schemes for Reduction of Intersymbol
                 Interference in Data Transmission Systems",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "343--353",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Various coding schemes and their effects on
                 intersymbol interference in pulse amplitude modulation
                 systems are discussed. First, the relation between
                 imperfections in the baseband-equivalent channel and
                 intersymbol interference is clarified and applied to
                 explain the effect of correlative level coding and
                 Gorog's frequency concept codes in reducing intersymbol
                 interference. Another coding scheme is then introduced;
                 construction of codes in the time domain with
                 intersymbol interference directly in mind. A decimal
                 code of length 4 and a alphanumeric code of length 6
                 are proposed as practical codes and their properties
                 are discussed. Simulation results are presented to give
                 quantitative comparison of these coding techniques.
                 Curves of the vertical eye-opening vs transmission rate
                 have been produced and it is shown that codes designed
                 in the time domain achieve better performance than both
                 the frequency concept codes and the conventional codes
                 for a wide class of channel characteristics.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6210L (Computer communications);
                 C6130 (Data handling techniques)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; communication channels; data communication
                 systems; data transmission; IBMJA; information theory;
                 interference; intersymbol interference; pulse-code
                 modulation; systems; transmission codes",
}

@Article{Croisier:1970:IPT,
  author =       "A. Croisier",
  title =        "Introduction to Pseudoternary Transmission Codes",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "354--367",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Many of the pseudoternary (PT) codes (twinned,
                 bipolar, partial response, etc.) used in data
                 transmission are described, with emphasis on their
                 spectral (or, more generally, statistical) properties.
                 Linear and nonlinear PT codes are considered, the
                 latter being divided into alphabetic and nonalphabetic
                 codes. Among the nonalphabetic codes, emphasis is given
                 to the modified bipolar codes used in pulse code
                 modulation systems. Two recently developed codes of
                 this type are described-\% High Density Bipolar (HDB)
                 and Compatible High Density Bipolar(CHDB). They are
                 particularly suitable for PCM transmission on repeater
                 lines. Another nonalphabetic code, the Transparent
                 Interleaved Bipolar (TIB) is presented for the first
                 time. This code features all the advantages of
                 partial-response (or Interleaved Bipolar) signalling
                 and, in addition, guarantees a minimum density of
                 pulses, regardless of the data.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding; data communication systems; data
                 transmission systems; IBMJA; information theory;
                 pseudoternary codes; pulse code modulation; radio
                 transmission; telephone, data transmission",
}

@Article{Kobayashi:1970:APC,
  author =       "H. Kobayashi and D. T. Tang",
  title =        "Application of partial-response channel coding to
                 magnetic recording systems",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "368--375",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); B6450D (Audio
                 recording media and techniques); C1260 (Information
                 theory); C5310 (Storage system design); C6130 (Data
                 handling techniques)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "audio recording; channel capacity; codes; magnetic
                 storage; signal processing; systems",
}

@Article{Franaszek:1970:SSM,
  author =       "P. A. Franaszek",
  title =        "Sequence-State Methods for Run-Length-Limited Coding",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "376--383",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.15",
  MRnumber =     "42 \#4313",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Methods are presented for the encoding of information
                 into binary sequences in which the number of zeros
                 occurring between each pair of successive ones has both
                 an upper and a lower bound. The approach taken is based
                 on the use of finite-state machines as models of the
                 run-length-limited sequence constraints. Algorithms
                 presented in a recent report are used to construct
                 synchronous (fixed-rate) codes that are optimal in the
                 sense that the maximum word length is minimized for a
                 given bit-per-symbol value. Word lengths of fixed-and
                 of variable-length codes in this class are compiled for
                 a number of (d,k) constraints. The results indicate
                 that varying the word length frequently yields codes
                 that are shorter and easier to implement. The problem
                 of error propagation, which arises in state-dependent
                 and variable-length coding, is studied. It is shown
                 that one can always limit error propagation in
                 fixed-length (d,k) codes by a proper assignment of
                 message digits to code words. A method for constructing
                 error-propagation-limiting, variable-length (d,k) codes
                 is described, the method being valid for the more
                 general case of constrained sequences with finite
                 memory. Some examples of code construction are included
                 to illustrate the methods.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); C1260
                 (Information theory); C6130 (Data handling
                 techniques)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "binary sequences; codes; data transmission;
                 finite-state machines; IBMJA; information theory;
                 processing; sequential circuits; signal",
}

@Article{Brown:1970:ECI,
  author =       "D. T. Brown and F. F. {Sellers, Jr.}",
  title =        "Error Correction for {IBM} 800-Bit-Per-Inch Magnetic
                 Tape",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "384--389",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The 800-bit-per-inch magnetic tape units that are
                 components of IBM System\slash 360 can correct error
                 bursts of unlimited length in any one of their nine
                 tape tracks. The correction technique employs a
                 modified cyclic code in conjunction with a parity bit
                 in each nine-bit character. There are nine check bits
                 in the modified cyclic code and these form a check
                 character at the end of every record. To perform the
                 correction, a record in which an error has been
                 detected must be reread. Errors involving more than one
                 track within the same record are detected but are not
                 correctable. This error correction technique operates
                 during both read-forward and read-backward operations,
                 and on records of any length.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); C1260
                 (Information theory); C5320C (Storage on moving
                 magnetic media); C6130 (Data handling techniques)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding; computers, errors; cyclic codes; error
                 compensation; error correction codes; IBMJA;
                 information theory; magnetic; magnetic tape; magnetic
                 tape storage; storage devices",
}

@Article{Hsiao:1970:OLS,
  author =       "M. Y. Hsiao and D. C. Bossen and R. T. Chien",
  title =        "Orthogonal {Latin} Square Codes",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "390--394",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.15",
  MRnumber =     "43 \#4548",
  bibdate =      "Tue Mar 06 15:32:24 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new class of multiple-error correcting codes has
                 been developed. Since it belongs to the class of
                 one-step-decodable majority codes, it can be decoded at
                 an exceptionally high speed. This class of codes is
                 derived from a set of mutually orthogonal Latin
                 squares. This mutually orthogonal property provides a
                 class of codes having a unique feature of `modularity'
                 The parity check matrix possesses a uniform pattern and
                 results in a small number of inputs to modulo 2 adders.
                 This class of codes has m**2 data bits, where m is an
                 integer, and 2tm check bits for t-error correcting.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding; error correction codes;
                 error-correcting codes; IBMJA; information theory",
  reviewer =     "N. J. A. Sloane",
}

@Article{Hsiao:1970:COM,
  author =       "M. Y. Hsiao",
  title =        "Class of Optimal Minimum Odd-Weight-Column {SEC-DED}
                 Codes",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "395--401",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The class of codes described is used for single-error
                 correction and double-error detection (SEC-DED). It is
                 equivalent to the Hamming SEC-DED code in the sense
                 that for a specified number k of data bits, the same
                 number of check bits r is used. The minimum
                 odd-weight-column code is suitable for applications to
                 computer memories or parallel systems. A computation
                 indicates that this code is better in performance, cost
                 and reliability than are conventional Hamming SEC-DED
                 codes.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding techniques; computers, digital;
                 computers, memories; error correction codes;
                 error-correcting codes; error-detection codes; IBMJA;
                 information theory",
}

@Article{Bossen:1970:BEC,
  author =       "D. C. Bossen",
  title =        "{B}-Adjacent Error Correction",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "402--408",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A high-speed method is derived for single-symbol error
                 correcting Reed, Solomon and Hamming type codes. A
                 matrix description is used for implementation of the
                 codes, in which single-error correction in the Galois
                 field 2b corresponds to correcting a block of b bits in
                 a binary field. The resulting codes correct not only
                 single-bit errors but also single clusters of
                 b-adjacent-bit errors. This method, being a hardware
                 technique, has the time for correction measured in
                 terms of a few logic levels rather than in terms of a
                 few processor cycles.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; computers, digital; error correction codes;
                 error-correcting codes; IBMJA; information theory",
}

@Article{Bossen:1970:EC,
  author =       "D. C. Bossen",
  title =        "$b$-adjacent error correction",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "??",
  pages =        "402--408",
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.15",
  MRnumber =     "43 \#3033",
  bibdate =      "Tue Sep 11 16:25:57 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "R. Alter",
}

@Article{Tang:1970:ECT,
  author =       "D. T. Tang and V. Y. Lum",
  title =        "Error Control for Terminals with Human Operators",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "409--416",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.10",
  MRnumber =     "42 \#4310",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The man-machine interface at any terminal in a
                 computer system is a likely source of error and can be
                 regarded as a noisy channel. Certain data, such as ID
                 numbers, can be precoded to protect against most-likely
                 errors, including transposition of adjacent symbols and
                 substitutions, as well as deletions and insertions.
                 Certain basic requirements for error detection with
                 minimum redundancy are considered. An efficient special
                 coding scheme designed for decimal terminals is
                 described next. Finally, certain cyclic codes are shown
                 to be adaptable to transposition error control when
                 appropriate decoding schemes are implemented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C1270 (Man-machine systems); C6130
                 (Data handling techniques)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; computers, codes; computers, digital; ed; error
                 correction codes; human engineering; IBMJA; man-machine
                 interfaces; man-machine systems; time sharing",
}

@Article{Savage:1970:TMD,
  author =       "J. E. Savage",
  title =        "Three Measures of Decoder Complexity",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "417--425",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.15",
  MRnumber =     "42 \#7399",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Three measures of the complexity of error correcting
                 decoders are considered, namely, logic complexity,
                 computation time and computational work (the number of
                 logic operations). Bounds on the complexity required
                 with each measure to decode with probability of error
                 Pe at code rate R are given and the complexity of a
                 number of ad hoc decoding procedures is examined.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "Brown Univ., Providence, RI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding; computers; error compensation; error
                 correction codes; error-correcting codes; IBMJA;
                 information theory",
  reviewer =     "G. M. Tenengol{\'c}",
}

@Article{Rocher:1970:AEH,
  author =       "E. Y. Rocher and R. L. Pickholtz",
  title =        "Analysis of the Effectiveness of Hybrid Transmission
                 Schemes",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "426--433",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A comparison is made of the performance of pure
                 retransmission, forward error correction, and hybrid
                 (error detecting\slash correcting) schemes for data
                 transmission in a noisy binary symmetric channel with a
                 probability of error greater than 10-**4. The
                 performance calculations are based on the use of BCH
                 codes for error detection and correction up to the full
                 correction capability of the code. It is shown that a
                 probability of undetected error of less than 10-**9
                 error\slash bit, can be achieved by correcting only a
                 few errors while retaining a reasonable throughput and
                 a very low retransmissionrate. The best codes in the
                 class considered are specified and the complexity of
                 instrumentation is estimated. Finally, various
                 combinations of possible systems employing half duplex
                 and reverse channel operation are used in a comparison
                 of the transmission schemes. For line error rate worse
                 than 10-**4 error\slash bit, a hybrid system operating
                 with a reverse channel is superior to the other
                 possibilities.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding error-correcting codes; communication
                 channels; computers, data transmission; data
                 transmission; data transmission systems; error
                 correction codes; error detection codes; hybrid
                 transmission schemes; IBMJA; IM",
}

@Article{Patel:1970:MGC,
  author =       "A. M. Patel",
  title =        "Maximal Group Codes with Specified Minimum Distance",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "434--443",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94.15",
  MRnumber =     "42 \#7395",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "All n-digit maximal block codes with a specified
                 minimum distance d such that 2d is equal to or greater
                 than n can be constructed from the Hadamard matrices.
                 These codes meet the Plotkin bound. The construction is
                 given for all maximal group codes in the region where
                 2d is equal to or greater than n, where d is a
                 specified minimum distance and n is the number of
                 digits per code word. Unlike the case of block codes,
                 the Plotkin upper limit, in general fails to determine
                 the number of code words B (n,d) in a maximal group
                 code in this region. It is shown that the value of B
                 (n,d) largely depends on the binary structure of the
                 number d. An algorithm is developed that determines
                 B(n,d), the maximum number of code words for given d
                 and n equal to or less than 2d. The maximal code is,
                 then, given by its modular representation, explicitly
                 in terms of certain binary coefficients and constants
                 related to n and d. As a side result, a new upper bound
                 is obtained on the number of code words in the region
                 where 2d is less than n which is, in general, stronger
                 than Ploktin's extended bound.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "codes; coding techniques; error-correcting codes;
                 IBMJA; information theory",
  reviewer =     "G. M. Tenengol\cprime c",
}

@Article{Jona:1970:LEE,
  author =       "F. Jona",
  title =        "Low Energy Electron Diffraction (Leed) Spectra
                 Aluminum",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "444--452, folding sheet",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The intensities of low energy electron beams
                 specularly and nonspecularly diffracted from (100),
                 (110) and (111) surfaces of aluminum have been measured
                 in a display-type LEED system as functions of electron
                 energy, angle of incidence and azimuthal angle. Several
                 of the measured and normalized spectra are presented,
                 and the procedures followed in aligning the sample,
                 reducing stray magnetic fields, and collecting and
                 normalizing the data are described.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6820 (Solid surface structure)",
  corpsource =   "State Univ. New York, Stony Brook, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "aluminium; aluminum metallography; crystals; electron
                 diffraction examination of materials; electron
                 diffraction spectra; IBMJA; ing; physics, solid state;
                 spectrum analysis; surface structure",
}

@Article{Dash:1970:SDS,
  author =       "S. Dash and M. L. Joshi",
  title =        "Silicon Defect Structure Induced by Arsenic Diffusion
                 and Subsequent Steam Oxidation",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "453--460",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Misfit dislocation nets are known to occur when very
                 high amounts of phosphorus and boron are diffused into
                 silicon single-crystal wafers. Diffusion of arsenic in
                 silicon is not known to produce such dislocations.
                 Through transmission electron microscopy it is shown
                 that diffusion of high amounts (up to 1.6x10**2**1
                 atoms\slash cm$^3$) of arsenic creates Frank hexagonal
                 loops on (111) planes parallel to the diffusion
                 surface, and stacking faults on the inclined (111)
                 planes, instead of misfit dislocation nets (the latter
                 are still not observed). These faults and loops are
                 found to be extrinsic, and are thought to be due to
                 insertion of extra silicon layers in the matrix where
                 the stacking fault energy is decreased by arsenic
                 atoms. The driving force for the generation of loops
                 and faults is shown to be the concentration gradient
                 rather than fast cooling.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170 (Defects in crystals); A6630 (Diffusion in
                 solids)",
  corpsource =   "Fairchild Semiconductor Res. and Dev. Lab., Palo Alto,
                 CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "arsenic; crystal defects; crystals, defects; diffusion
                 in solids; dislocations; IBMJA; oxidation; physics;
                 semiconductors, silicon; silicon; solid state",
}

@Article{Ames:1970:REA,
  author =       "I. Ames and F. M. D'Heurle and R. E. Horstmann",
  title =        "Reduction of Electromigration in Aluminum Films by
                 Copper Doping",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "4",
  pages =        "461--463",
  month =        jul,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In accelerated life testing of thin-aluminum-film
                 conduction stripes, which are in widespread use in
                 planar semiconductor devices and integrated circuits,
                 it was found that the lifetime of aluminum films
                 subjected to high current densities at elevated
                 temperatures can be increased by the addition of
                 copper. Previous studies have indicated that the
                 failure mechanism is a combination of
                 electromigration-induced phenomena, including
                 nucleation and growth of voids, which are gated
                 primarily by material transport along grain boundaries.
                 On the basis of the present study, it appears that the
                 presence of copper causes an appreciable retardation in
                 the rate at which this overall combination of processes
                 takes place, thereby producing a considerable increase
                 in lifetime.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7215 (Electronic conduction in metals and alloys);
                 A7360 (Electronic properties of thin films); B2110
                 (Conductors)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "aluminium; conductivity of solids; copper; electric
                 conductors; electric conductors, testing; electrical;
                 electrical conductivity; IBMJA; metals; physics, solid
                 state; thick films; thin film conductors; thin films;
                 YST",
}

@Article{Goodman:1970:SEF,
  author =       "J. W. Goodman and A. M. Silvestri",
  title =        "Some Effects of {Fourier}-Domain Phase Quantization",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "478--484",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "By means of a biased limiter model, the effects of
                 Fourier-domain phase quantization are studied.
                 Amplitude information is assumed fully retained, while
                 phas is quantized to N equally spaced levels. The
                 recovered function is shown to consist of several
                 different contributions, the relative strengths of
                 which depend on the number of phase quantization
                 levels. Several specific examples are given. Motivation
                 and interpretation are presented in terms of digitally
                 constructed holograms.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography); C4190 (Other
                 numerical methods)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "computers, graphics; Fourier analysis; Fourier
                 transforms; holography; IBMJA; image processing; light,
                 modulation; mathematics",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Patau:1970:IFU,
  author =       "J. C. Patau and L. B. Lesem and P. M. Hirsch and J. A.
                 {Jordan, Jr.}",
  title =        "Incoherent Filtering Using Kinoforms",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "485--491",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:28 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The kinoform is a computer-generated
                 wavefront-reconstruction device that may be thought of
                 as a complicated, computer-defined lens, whose surface
                 (for an off-axis point image) is analogous to that of
                 an accurately made blazed grating that diffracts light
                 into a single diffraction order. Incoherent optical
                 filtering with the kinoform used as a filtering element
                 is discussed. Kinoform theory is briefly reviewed and
                 initial results with `fan' and correlation filters are
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4280C (Spectral and other filters); B6140C (Optical
                 information, image and video signal processing); B7260
                 (Display technology and systems); C1250 (Pattern
                 recognition)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "IBM, Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "ATU; computers, graphics; filtering and prediction
                 theory; filters; IBMJA; image processing; optical
                 filters; optical images; optical information
                 processing; pattern; recognition; signal processing",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Milder:1970:AHC,
  author =       "D. M. Milder and W. H. Wells",
  title =        "Acoustic Holography with Crossed Linear Arrays",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "492--500",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An analysis is given of how acoustic (or microwave)
                 holography can be applied to large masses, such as
                 natural bodies of water or the earth, by means of a
                 linear array of microphones and by scanning with one or
                 more transmitters to produce holographic phase shifts.
                 This type of hologram, in which the phased array has a
                 conical antenna pattern, is shown to be superior to the
                 area hologram for computing images in the near field.
                 Computer simulations are given of virtual holograms and
                 image reconstructions for specular and diffuse
                 reflectors; simulations are also made for the case of
                 pulse holography.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4363 (Acoustic holography); A4385 (Acoustical
                 measurements and instrumentation); B4350 (Holography);
                 B7260 (Display technology and systems)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "acoustic imaging; acoustics; computers, graphics;
                 holography; IBMJA; image processing; light,
                 modulation",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Winthrop:1970:SSH,
  author =       "J. T. Winthrop",
  title =        "Structural-Information Storage in Holograms",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "501--508",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The number of degrees of freedom, or
                 structural-information content, of the object wave
                 field recorded in a Leith-Upatnieks hologram is
                 expressed in terms of the resolving power and
                 dimensions of the recording medium, the coherence
                 properties of the primary illumination and the position
                 of the point reference source. In contrast with
                 previous studies, the calculation does not involve the
                 paraxial approximation. It is shown that of all
                 holograms, the Fourier-transform hologram makes the
                 most efficient use of available resolving power and
                 coherence length.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography); C5320Z (Other
                 digital storage)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "holography; IBMJA; information theory; light,
                 modulation; optical information processing; ore",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Gabor:1970:LSE,
  author =       "D. Gabor",
  title =        "Laser Speckle and its Elimination",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "509--514",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:32:46 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The causes of `subjective' and `objective' speckle are
                 explained. Subjective speckle cannot be reduced except
                 by extending the aperture. The objective speckle in a
                 plane, for instance, in the plane of a transparency,
                 can be reduced, and in the limit made invisible, by a
                 special type of wide-angle illumination. This consists
                 of a one-parameter family of plane waves, which can be
                 produced by diffraction at a special grating, or two
                 crossed gratings, close to the object plane. This makes
                 it possible to produce multiple homograms, with the
                 same insensitivity to dust or scratches as diffused
                 holograms, but without any visible speckle in the
                 reconstruction.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "CBS Labs., Stamford, CT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "holography; IBMJA; laser speckle; lasers; light,
                 modulation",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Lorber:1970:TGB,
  author =       "H. W. Lorber",
  title =        "Theory of Granularity and Bleaching for Holographic
                 Information Recording",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "515--520",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Kelly three-stage model of photographic
                 information recording is a mathematical model of
                 black-and-white silver halide film with granularity
                 neglected. In the work reported here, theory is
                 extended for use in phase-holographic applications.
                 Granularity effects are contained in the fourth and
                 final stage, a two-dimensional, nonhomogeneous,
                 filtered Poisson process. The output of this stage is a
                 sample function of the random process that describes
                 the pattern of modification of the emulsion. Formulas
                 for the signal-to-noise ratio of a hologram and the
                 optimum granular behavior are derived as examples of
                 the use of the granularity model.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); A0768 (Photography, photographic
                 instruments and techniques); B4350 (Holography)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "EG and G Inc., Las Vegas, NV, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "holography; IBMJA; light, modulation; photographic
                 applications; photographic emulsions; photography;
                 photography, holography; us",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Falconer:1970:NDP,
  author =       "D. G. Falconer",
  title =        "Noise and Distortion in Photographic Data Storage",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "521--526",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Noise, which tends to be multiplicate, derives from
                 the random distribution of silver grains in the
                 photographic image, as well as from thickness
                 variations in the developed emulsion. Distortion, on
                 the other hand, results from the nonlinear relation
                 between transmittance and exposure, the finite width of
                 the emulsion's point-spread function and the existence
                 of an adjacency-enhancement function. Although grain
                 noise remains intrinsic and untreatable, nonlinear
                 distortion, both global and local may be treated by
                 lowering the contrast of the exposure pattern or,
                 preferably, by recording the data in the form of a
                 phase-modulated carrier wave, as in holography. A
                 solution to the remaining difficulty, namely,
                 linear-global distortion, is obtained through the use
                 of high-resolution, Lippmann-type emulsions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B7260 (Display technology and systems)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "Stanford Res. Inst., Menlo Park, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "data storage; electric distortion; holography; IBMJA;
                 light, modulation; noise; photography",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Upatnieks:1970:CDH,
  author =       "J. Upatnieks and C. D. Leonard",
  title =        "Characteristics of Dielectric Holograms",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "527--532",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The diffraction efficiency and snr ratio for
                 two-dimensional and volume diffuse-signal-beam
                 holograms are calculated and experimentally determined.
                 Calculations are based on the statistical properties of
                 the signal beam, and exact integrals rather than series
                 approximations are used. High signal-to-noise ratio and
                 high diffraction efficiency are possible, with the peak
                 calculated diffraction efficiency being 22\% for
                 two-dimensional and 64\% for volume holograms. The
                 experimentally achieved efficiencies were 12\% for
                 two-dimensional and 36\% for volume holograms.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "Univ. Michigan, Ann Arbor, MI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "holography; light, modulation",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Schmackpfeffer:1970:HPG,
  author =       "A. Schmackpfeffer and W. J{\"a}risch and W. W.
                 Kulcke",
  title =        "High-Efficiency Phase-Hologram Gratings",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "533--538",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Optimum conditions for the generation of
                 high-efficiency hologram gratings are presented. The
                 most efficient phase holograms were obtained for
                 exposures 10 to 20 times larger than those for
                 optimally exposed amplitude holograms. Hologram
                 gratings produced on Agfa Gevaert 8 E 70 recording
                 plates diffracted 40\% of the incident radiation into
                 the holographic image. This experimentally obtained
                 efficiency is 60\% of the theoretical maximum for a
                 hologram with a geometric parameter Q of 4.6.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "holography; IBMJA; light, modulation; photography",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Ferdinand:1970:SMA,
  author =       "A. E. Ferdinand",
  title =        "A statistical mechanical approach to systems
                 analysis",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "539--547",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90.30 (94.00)",
  MRnumber =     "42 \#7244",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "212.51602",
  abstract =     "The maximum entropy principle is used as the criterion
                 for calculating the equilibrium state probabilities of
                 a queuing or network system in which service rates are
                 exponentially distributed. A configuration-independent
                 partition function is given as the solution to this
                 network problem; from this function the important
                 properties of the system may be derived. Simple and
                 well known examples are used to illustrate the method.
                 A phenomenon similar to the phase transition of
                 statistical mechanics is observed in a queuing model.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "computers; IBMJA; queueing theory; queuing theory;
                 statistical mechanics; statistical methods; systems
                 analysis; systems engineering",
  reviewer =     "R. L. Kashyap",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Casey:1970:MNH,
  author =       "R. G. Casey",
  title =        "Moment Normalization of Handprinted Characters",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "548--557",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "205.17904",
  abstract =     "Handprinted characters can be made more uniform in
                 appearance than the as-written version if an
                 appropriate linear transformation is performed on each
                 input pattern. The transformation can be implemented
                 electronically by programming a flying-spot
                 raster-scanner to scan at specified angles rather than
                 only along specified axes. Alternatively,
                 curve-follower normalization can be achieved by
                 transforming the coordinate waveforms in a linear
                 combining network. Second-order moments of the pattern
                 are convenient properties to use in specifying the
                 transformation. By mapping the original pattern into
                 one having a scalar-moment matrix, all linear pattern
                 variations can be removed. Comparison experiments are
                 described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "IBM Thomas, J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "character recognition; computers; computers, circuits;
                 computers, pattern recognition; IBMJA; optical
                 character recognition; pattern recognition",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Durbeck:1970:PES,
  author =       "R. C. Durbeck",
  title =        "Performance equivalence of suboptimally controlled
                 nonlinear systems",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "558--562",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93.40",
  MRnumber =     "42 \#5670",
  bibdate =      "Tue Mar 06 15:32:50 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "205.15605",
  abstract =     "A procedure is described that shows how a technique
                 used to develop performance bounds for a large class of
                 nonlinear dynamic systems with state-dependent control
                 policies can be extended to determine whether a
                 nonlinear system can be controlled so that it is at
                 least `performance equivalent' to an associated
                 optimally controlled linear system. A procedure for
                 generating one or more control policies to attain this
                 equivalence is also discussed. An example illustrates
                 the fact that more than one control policy may satisfy
                 the equivalence criterion.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1330 (Optimal control); C1340K (Nonlinear control
                 systems)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "automatic control; IBMJA; linear systems; nonlinear
                 systems; optimisation; optimization; performance
                 index",
  reviewer =     "D. F. Lawden",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Langdon:1970:CED,
  author =       "G. G. {Langdon, Jr.} and C. K. Tang",
  title =        "Concurrent Error Detection for Group Look-Ahead Binary
                 Adders",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "563--573",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68.00 (94.00)",
  MRnumber =     "42 \#1373",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The relative merits of two schemes for performing
                 concurrent error detection are evaluated. One of the
                 schemes is a residue mod 3 check and the other is a
                 parity prediction check. The Boolean statements that
                 define the operation of group look-ahead adders,
                 concurrent error detection and the Boolean difference
                 serve as background for interpreting the results of the
                 study. Some weaknesses in prior studies of coverage
                 calculation are brought to light. Tables showing the
                 number of circuit elements in the various portions of
                 adder and error-checking circuits are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130 (Data handling techniques)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "adders; binary adders; codes; computers; computers,
                 errors; error detection; IBMJA",
  reviewer =     "J. Kuntzmann",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Kinberg:1970:IMS,
  author =       "C. Kinberg and B. W. Landeck",
  title =        "Integrated manufacturing systems: architectural
                 considerations",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "589--604",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3355 (Control applications in manufacturing
                 processes)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automation; communication; computers; control system
                 analysis; control system synthesis; equipment control;
                 hierarchy concepts; implementation; information
                 systems; integrated control systems; integrated
                 manufacturing systems; man machine interface;
                 manufacturing processes; operational environment;
                 plant; processors; production support; programming;
                 real time systems; system architecture; system
                 requirements",
  treatment =    "P Practical",
}

@Article{Stuehler:1970:IMP,
  author =       "J. E. Stuehler",
  title =        "An integrated manufacturing process control system:
                 implementation in {IBM} manufacturing",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "605--613",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7420 (Control engineering computing)",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architecture; central computer system; channels;
                 communication equipment; control engineering
                 applications of computers; data; digital systems; high
                 speed data; IBM 360; integrated control; integrated
                 manufacturing process control; on line; OS/360; process
                 control; production; satellite processors; system;
                 systems",
  treatment =    "P Practical",
}

@Article{Thoburn:1970:TCU,
  author =       "F. W. Thoburn",
  title =        "A transmission control unit for high-speed
                 computer-to-computer communication",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "614--619",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cables; coaxial; computer to computer; computers; data
                 communication equipment; data modulation; fast-response
                 computer; high speed communication; IBM;
                 microprogrammed polling; microprogramming;
                 multiplexing; noise suppression; process control;
                 satellite; servicing; systems; terminal connections;
                 transmission control unit design",
  treatment =    "P Practical",
}

@Article{Calva:1970:PPC,
  author =       "J. R. Calva",
  title =        "{PCOS}: a process control extension to {Operating
                 System\slash 360}",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "620--632",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems); C7420 (Control engineering
                 computing)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architecture; control engineering applications of
                 computers; data routing; fetch module; IBM; operating;
                 OS/360 extensions; PCOS; process control; real time;
                 real-time systems; supervisory programs; systems
                 (computers)",
  treatment =    "A Application; P Practical",
}

@Article{Fischer:1970:CTF,
  author =       "R. B. Fischer and C. M. Cox and C. Holdinsky",
  title =        "Computer-aided testing and fabrication of magnetic
                 tape heads",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "633--640",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7410B (Power engineering computing)",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications of computers; automatic testing; complex
                 impedance; computer aided testing; control; data
                 acquisition; engineering; hysteresis; IBM 1130;
                 identification; magnetic tape equipment; magnetic tape
                 heads; manufacture; modules; part; process; process
                 flow; software control; System 360 satellite; test
                 terminals; vector impedance meter",
  treatment =    "A Application; P Practical",
}

@Article{Radio:1970:PAM,
  author =       "M. R. Radio and S. A. Schmitt and S. H. Lewis and T.
                 G. Merry and J. L. Evjen",
  title =        "Precision automatic measuring of {X-Y} coordinates",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "641--651",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7400 (Engineering computing)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "100 microinches tolerance; aperture roughness;
                 automatic testing; computer control; computers; control
                 engineering applications of; data analysis; distance
                 measurement; edge detection; inspection; laser
                 interferometer; monitoring; PAMM; part; photodetector
                 shot noise; position; precision automatic measurement;
                 scanner; X-Y coordinate measurement",
  treatment =    "P Practical",
}

@Article{Harrison:1970:ISP,
  author =       "T. J. Harrison and R. L. Homiak and G. U. Merckal",
  title =        "{IBM System\slash 7} and plant automation",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "652--661",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers); C7420 (Control
                 engineering computing)",
  corpsource =   "IBM, Boca Raton, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; architectural concepts; computer
                 architecture; computers; control; control engineering
                 applications of; data acquisition; design features;
                 facilities; functional characteristics; hardware; IBM;
                 manufacturing; plant automation; process; processor
                 module; software; special purpose computers; System 7;
                 system organisation; test",
  treatment =    "A Application; P Practical",
}

@Article{Hippert:1970:IDT,
  author =       "R. O. {Hippert, Jr.}",
  title =        "{IBM} 2790 digital transmission loop",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "662--667",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  corpsource =   "IBM, Triangle Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cable; clock; connection; data acquisition; data
                 collection; digital; digital communication systems;
                 digital transmission loop; high speed; IBM 2790; line
                 driver; repeater; systems; tandem; terminals",
  treatment =    "P Practical",
}

@Article{Henderson:1970:PTE,
  author =       "D. J. Henderson and J. A. Barker and R. O. Watts",
  title =        "The {Percus--Yevick} theory and the equation of state
                 of the 6:12 fluid",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "668--676",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4710 (General fluid dynamics theory, simulation and
                 other computational methods)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "6:12 fluid; calculation; compressibility;
                 computational method; distribution function; equation
                 of state; equations of state; fluids; identities;
                 indirect method of calculation; machine; pair; Percus
                 Yevick theory; thermodynamic",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Marcus:1970:ICM,
  author =       "M. P. Marcus and W. H. Niehoff",
  title =        "Iterated consensus method for multiple-output
                 functions",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "677--679",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; Boolean functions; iterated consensus
                 method; iterative methods; multiple output functions;
                 prime implicants",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Filipowsky:1970:CMT,
  author =       "R. F. Filipowsky",
  title =        "On the correlation matrices of trigonometric product
                 functions",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "680--685",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1120 (Mathematical analysis)",
  corpsource =   "IBM, Huntsville, AL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "communications technology; correlation matrices;
                 correlation methods; cross correlation coefficients;
                 factors; harmonic; matrix algebra; network analysis;
                 Parseval's theorem; signal processing; trigonometric
                 product functions; waveform analysis; waveforms",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Blakeslee:1970:MSC,
  author =       "A. E. Blakeslee and C. F. Aliotta",
  title =        "Man-made superlattice crystals",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "686--688",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8110B (Crystal growth from vapour)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AsH/sub 3/-PH/sub 3/-Ga-HCl; characterization;
                 crystal; crystal atomic structure of inorganic
                 compounds; crystal growth process; dimensional
                 superlattice approximation; formation by; GaAs/sub
                 1-x/P/sub x/; gallium arsenide; growth; lattice theory
                 and statistics; methods of; one-; periodically pulsing
                 PH/sub 3/; synthetic superlattice crystals; vapour
                 growth",
  treatment =    "X Experimental",
}

@Article{Aas:1970:CTT,
  author =       "E. J. Aas",
  title =        "Comment on `{A} topological theory of domain velocity
                 in semiconductors'",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "6",
  pages =        "689--690",
  month =        nov,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:25:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Gunn:1969:TTD}.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); B2560F (Bulk effect
                 devices)",
  corpsource =   "Inst. Technol., Trondheim, Norway",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "diffusion controlled domain; domain velocity; domains;
                 semiconductors; topological theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Anonymous:1970:CHC,
  author =       "Anonymous",
  title =        "Conference on holography and the computer",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "5",
  pages =        "??--??",
  month =        sep,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240 (Holography); B4350 (Holography); C5320Z (Other
                 digital storage)",
  conflocation = "Houston, TX, USA; 10-12 Dec. 1969",
  conftitle =    "Conference on holography and the computer",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "holography",
  sponsororg =   "Optical Soc. America, Gulf Coast section; IBM Corp",
}

@Article{Anonymous:1970:SMS,
  author =       "Anonymous",
  title =        "Symposium on magnetic semiconductors",
  journal =      j-IBM-JRD,
  volume =       "14",
  number =       "3",
  pages =        "??--??",
  month =        may,
  year =         "1970",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7125 (Nonlocalized single-particle electronic
                 states); A7500 (Magnetic properties and materials);
                 A7800 (Optical properties and condensed matter
                 spectroscopy and other interactions of matter with
                 particles and radiation); A7220 (Electrical
                 conductivity phenomena in semiconductors and
                 insulators); A7280 (Conductivity of specific
                 semiconductors and insulators)",
  conflocation = "Yorktown Heights, NY, USA; 13-14 Nov. 1969",
  conftitle =    "Symposium on magnetic semiconductors",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "band structure; electrical conductivity of solids;
                 electron; magnetic materials; magnetic properties of;
                 magnetisation state; mobility; semiconductor materials;
                 substances",
  sponsororg =   "American Phys. Soc.; IBM Corp",
}

@Article{Kwok:1971:DSG,
  author =       "H. C. W. Kwok and W. E. Langlois and R. A. Ellefsen",
  title =        "Digital simulation of the global transport of carbon
                 monoxide",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "3--9",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9260 (Lower atmosphere); C7320 (Physics and chemistry
                 computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "atmosphere; atmospheric composition; carbon compounds;
                 chaining effects; CO; cumulus convection; digital
                 simulation; gasoline consumption; global transport;
                 northern hemisphere sources; physics; prevailing
                 westerly winds; subscale; vertical transport",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hunziker:1971:NTG,
  author =       "H. E. Hunziker",
  title =        "A new technique for gas-phase kinetic spectroscopy of
                 molecules in the triplet state",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "10--26",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765 (Optical spectroscopy and spectrometers); A3320
                 (Molecular spectra grouped by wavelength ranges);
                 A3350H (Molecular radiationless transitions); A3370F
                 (Molecular lifetimes, absolute and relative line and
                 band intensities)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "absorption; benzene; gas phase kinetic spectroscopy;
                 Hg photosensitization; lifetime; measurements;
                 modulated Hg resonance light source; molecular
                 excitation; molecules; molecules and substances;
                 naphthalene; organic compounds; polyatomic; population;
                 spectra of organic; spectroscopic light sources;
                 spectroscopy; toluene; triplet states",
  treatment =    "N New Development; X Experimental",
}

@Article{Castro:1971:PAH,
  author =       "G. Castro",
  title =        "Photoconduction in aromatic hydrocarbons",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "27--33",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7240 (Photoconduction and photovoltaic effects;
                 photodielectric effects)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "aromatic hydrocarbons; benzene; biphenyl; crystal
                 growth; drift mobilities; exciton exciton collision
                 ionization; generation; growth; naphthalene; organic
                 compounds; photoconduction; photoconductivity;
                 purification; pyrene; single crystals; single photon",
  treatment =    "X Experimental",
}

@Article{Young:1971:PTS,
  author =       "W. R. Young and I. Haller and A. Aviram",
  title =        "Preparation and thermodynamics of some homologous
                 nitrones, a new group of liquid crystals",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "41--51",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6470M (Transitions in liquid crystals)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "aldonitrones; alkoxy chain length; liquid crystals;
                 mesophase isotropic; mesophases; N-(p-alkoxyphenyl)
                 alpha anisylnitrones; nematic; nematic isotropic;
                 organic compounds; phase transformations; preparation;
                 smectic mesophases; thirteen homologs; transition;
                 transition entropy",
  treatment =    "X Experimental",
}

@Article{Vogel:1971:PCE,
  author =       "M. J. Vogel and E. M. Barrall and C. P. Mignosa",
  title =        "Polymorphism in cholesteryl esters: cholesteryl
                 palmitate",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "52--8",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6130 (Liquid crystals); A6470M (Transitions in liquid
                 crystals)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cholesteric isotropic liquid transition; cholesterol
                 ester; cholesteryl esters; cholesteryl palmitate;
                 impurity effect; isomeric; liquid crystals; organic
                 compounds; phase transformations; polymorphism; related
                 compound interaction; smectic cholesteric; smectic
                 monotropic mesophase; solid mesophase transition
                 temperature; thermal transitions; transition",
  treatment =    "X Experimental",
}

@Article{Yannoni:1971:MNM,
  author =       "C. S. Yannoni",
  title =        "On measuring nuclear magnetic shielding anisotropies
                 in liquid crystal solvents",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "59--63",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7660 (Nuclear magnetic resonance and relaxation)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "/sup 1/h; /sup 19/f containing molecules;
                 6<or=A<or=19; containing molecules; liquid crystal;
                 liquid crystals; nematic phase; nuclear magnetic
                 resonance; nuclear magnetic shielding anisotropies;
                 nuclei with; nuclei with A<or=5; single phase
                 measurement; solvents",
  treatment =    "X Experimental",
}

@Article{Kobayashi:1971:APD,
  author =       "H. Kobayashi",
  title =        "Application of probabilistic decoding to digital
                 magnetic recording systems",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "64--74",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C5320E
                 (Storage on stationary magnetic media); C6130 (Data
                 handling techniques)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; correlative level; decoding; decoding
                 errors; digital magnetic recording systems; digital
                 storage; encoder; information theory; magnetic storage;
                 maximum likelihood decoding method; recording;
                 systems",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Schaffert:1971:NHO,
  author =       "R. M. Schaffert",
  title =        "A new high-sensitivity organic photoconductor for
                 electrophotography",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "1",
  pages =        "75--89",
  month =        jan,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0768 (Photography, photographic instruments and
                 techniques); A7240 (Photoconduction and photovoltaic
                 effects; photodielectric effects)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.15; 1 to 1; carrier generation; charge acceptance;
                 charging; corona; dark decay; electrophotography;
                 films; materials; molar 2,4,7-trinitro-9-fluorenone
                 poly-n-vinylcarbazole; organic compounds; organic
                 polymeric photoconductor; panchromatic in visible
                 spectrum; photoconductivity; photographic;
                 photosensitivity; polymers; quantum efficiency",
  treatment =    "N New Development; X Experimental",
}

@Article{Bayer:1971:WEC,
  author =       "R. G. Bayer and J. L. Sirico",
  title =        "Wear of electrical contacts due to small-amplitude
                 motion",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "103--107",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2180 (Electrical contacts)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electrical contacts; IBM; model; sliding contact; wear
                 due to small amplitude motion",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Engle:1971:APS,
  author =       "P. A. Engle and H. D. Conway",
  title =        "Adhesion and partial slip between normally loaded
                 round surfaces",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "116--122",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6220P (Tribology); A8140P (Friction, lubrication, and
                 wear)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; contact; Coulomb friction; energy
                 dissipation; friction; normally loaded round surfaces;
                 partial slip; rigid roller; rigid sphere; slip; stress
                 analysis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Howard:1971:ADD,
  author =       "J. K. Howard and P. J. Smith",
  title =        "Analysis of defect distribution in transistor
                 structures with reflection and transmission {X}-ray
                 topography",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "123--131",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170 (Defects in crystals); B2550 (Semiconductor
                 device technology); B2560S (Other field effect
                 devices); B2570 (Semiconductor integrated circuits)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; defect distribution; defects; depth of
                 defect visibility; dislocations; effect of dislocation
                 density; estimate; gamma-ray applications; integrated
                 circuit; reflection X-ray topography; semiconductor;
                 semiconductor defects; testing; transistor structures;
                 transistors; transmission X-ray topography; X-ray;
                 X-ray examination of materials",
  treatment =    "P Practical",
}

@Article{Makris:1971:EET,
  author =       "J. Makris and A. Ferris-Prabhu and M. L. Joshi",
  title =        "Effect of extremely thin nitrogenous surface films on
                 phosphorus-impurity profiles in silicon",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "132--139",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6630J (Diffusion, migration, and displacement of
                 impurities in solids); A7220 (Electrical conductivity
                 phenomena in semiconductors and insulators); A7280C
                 (Conductivity of elemental semiconductors); B0520 (Thin
                 film growth); B2550 (Semiconductor device technology);
                 B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560 (Semiconductor devices)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal impurities; dependence; diffusion; diffusion
                 barriers; diffusion in solids; elemental
                 semiconductors; extremely thin nitrogeneous surface
                 film effect; films; impurity concentration in carrier
                 gas dependence; mathematical model; nitrogen;
                 phosphorus; phosphorus impurity profile; semiconductor
                 defects; semiconductor device models; semiconductor
                 materials; silicon; temperature",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Anderson:1971:MED,
  author =       "H. R. {Anderson, Jr.} and E. A. Bartkus and J. A.
                 Reynolds",
  title =        "Molecular engineering in the development of materials
                 for thermoplastic recording",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "140--150",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A3620 (Macromolecules and polymer molecules)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "charging; copolymers; corona; electron geams effects;
                 erase temperatures; in air recording; in vacuum
                 recording; materials; molecular engineering; molecular
                 weight; photoconductivity; plastic deformation;
                 polymers; recording; Schlieren optical readout;
                 terpolymers; thermoplastic recording; viscosity",
  treatment =    "X Experimental",
}

@Article{Pesch:1971:CBD,
  author =       "J. A. Pesch",
  title =        "On the correlation between domain size and coercive
                 force in grain-oriented 3.25\% {Si-Fe}",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "151--152",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7560E (Magnetization curves, hysteresis, Barkhausen
                 and related effects); B3110C (Ferromagnetic
                 materials)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "alloys; coercive; components; data processing
                 machines; domains; ferromagnetic properties of
                 substances; force; grain oriented Si-Fe; iron; largest
                 spike shaped magnetic domains measurement; magnetic
                 materials; magnetisation; non toroidal magnetic;
                 silicon compounds",
  treatment =    "A Application; P Practical",
}

@Article{Hoffman:1971:SMR,
  author =       "R. L. Hoffman and J. W. McCullough",
  title =        "Segmentation methods for recognition of
                 machine-printed characters",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "153--165",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "machine printed characters; optical character
                 recognition; quasitopological segmentation; topological
                 segmentation",
  treatment =    "P Practical",
}

@Article{Duke:1971:SVT,
  author =       "K. A. Duke and H. D. Schnurmann and T. I. Wilson",
  title =        "System validation by three-level modelling synthesis",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "2",
  pages =        "166--174",
  month =        mar,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1220 (Simulation, modelling and identification);
                 C5200 (Logic design and digital techniques)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architecture; computer; computer architecture;
                 computer design; design; hardware logic; logic design;
                 microprogramming; mismatches identification; modelling;
                 system programming; system validation; three level
                 modelling synthesis",
  treatment =    "P Practical",
}

@Article{Fromm:1971:NMC,
  author =       "J. E. Fromm",
  title =        "Numerical method for computing nonlinear, time
                 dependent, buoyant circulation of air in rooms",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "186--196",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4170 (Differential equations)",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air circulation; algorithms; buoyant circulation;
                 computing; dependent; difference equations;
                 environmental; flow direction; Grashof numbers; heat
                 transfer coefficients; leading phase errors; nonlinear
                 differential equations; nonlinear partial differential
                 equations; nonlinear stability; numerical method;
                 numerical methods; rooms; temperatures; time; time
                 splitting",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Smart:1971:RMS,
  author =       "J. S. Smart and V. L. Moruzzi",
  title =        "Random-walk model of stream network development",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "197--203",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7390 (Other natural sciences computing)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "dendritic networks; drainage density; fluvial erosion;
                 headward growth model; modelling; natural sciences;
                 outlet density; random processes; random walk model;
                 slope; stream network development; uniform lithology",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Guido:1971:APP,
  author =       "A. A. Guido and L. Fulkerson and P. E. Stuckert",
  title =        "Automatic pulse parameter determination with the
                 {Computer Augmented Oscilloscope System}",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "204--212",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7320 (Physics and chemistry computing)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "alphanumeric display; analysis; automatic pulse
                 parameter determination; calibration; Computer
                 Augmented; data; digital acquisition; display systems;
                 graphics; instrumentation; laboratory experiments;
                 Oscilloscope System; pulse waveform interpretation;
                 system control; waveform analysis; waveform data",
  treatment =    "P Practical; X Experimental",
}

@Article{Seki:1971:QAE,
  author =       "H. Seki and I. P. Batra and W. D. Gill and K. K.
                 Kanazawa and B. H. Schechtman",
  title =        "A quasi-steady-state analysis for the
                 electrophotographic discharge process",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "213--221",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0768 (Photography, photographic instruments and
                 techniques); B4200 (Optoelectronic materials and
                 devices); B8660 (Power applications in printing
                 industries)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "amorphous Se; analysis; electrophotographic discharge;
                 free carrier lifetimes; homogeneous photoconductor;
                 nonlinear differential equations; numerical; one
                 dimensional; photoconducting materials;
                 photoconductivity; photography; photoinjection;
                 process; quasi steady state analysis; selenium;
                 trapping times",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lester:1971:IPB,
  author =       "W. A. {Lester, Jr.}",
  title =        "Interaction potential between {Li$^+$} and {HD}:
                 region for rotational excitation cross sections",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "222--229",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A3310E (Rotational analysis (molecular spectra));
                 A3370F (Molecular lifetimes, absolute and relative line
                 and band intensities); A3420 (Interatomic and
                 intermolecular potentials and forces); A3440 (Elastic
                 scattering of atoms and molecules); A3450 (Inelastic
                 scattering of atoms and molecules); A3520P (Molecular
                 rotation, vibration, and vibration-rotation
                 constants)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "atomic collision processes; cross sections; energy;
                 energy surface; excitation; HD; hydrogen neutral
                 molecules; interaction potential; intermolecular
                 potentials; internal vibrational; Li/sup +/; lithium;
                 molecular; molecular collision processes; molecular
                 rotation; perturbation theory; potential;
                 probabilities; rotational excitation; rotational
                 transition; self consistent field calculation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dushkes:1971:DSU,
  author =       "S. Z. Dushkes",
  title =        "A design study of ultrasonic bonding tips",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "230--235",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170G (General fabrication techniques); B7820 (Sonic
                 and ultrasonic applications)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Au plated; boards; bonding failure; CuBeO wire; design
                 study; electronic circuit; electronic equipment
                 manufacture; joining processes; lug down; standing
                 wave; ultrasonic applications; ultrasonic bonding tips;
                 wire density",
  treatment =    "P Practical; X Experimental",
}

@Article{Lederle:1971:HCA,
  author =       "G. M. Lederle",
  title =        "Heat-transfer calculations at the tape-head interface
                 of a computer tape drive",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "236--241",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C5320 (Digital
                 storage)",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "21 degrees C; computer metatheory; computer tape
                 drive; drive; frictional heat transfer calculations;
                 hot spotting; IBM 2400 series tape; interface; magnetic
                 tape equipment; magnetic tape head; physics",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Bush:1971:CFE,
  author =       "D. R. Bush",
  title =        "The common-core filter as an electromagnetic
                 interference-suppression device",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "3",
  pages =        "242--244",
  month =        may,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1270 (Filters and other networks)",
  corpsource =   "IBM, Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "common core filter; device; electromagnetic
                 interference suppression; filters; interference
                 suppression; noise suppression devices; powerline
                 filters",
  treatment =    "P Practical; X Experimental",
}

@Article{Marinace:1971:EFO,
  author =       "J. C. Marinace",
  title =        "Experimental fabrication of one-dimensional {GaAs}
                 laser arrays",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "258--264",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4320J (Semiconductor lasers)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arrays; diffusion; EuO film memory system; films; GaAs
                 laser; injection laser fabrication; magnetic thin film
                 devices; semiconductor lasers; semiconductor materials;
                 thermal writing on magnetic; Zn diffusion",
  treatment =    "X Experimental",
}

@Article{Sprokel:1971:FPM,
  author =       "G. J. Sprokel",
  title =        "Fabrication and properties of monolithic laser diode
                 arrays",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "265--271",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B4320J (Semiconductor lasers)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Ag; Al/sub 2/O/sub 3/; arrays; Cr; diffusion; EuO
                 film; liquid nitrogen cooling; magnetooptical;
                 manufacturing processes; masking; memories; monolithic
                 laser diode; Ni; photolithography; planar diffused GaAs
                 injection lasers; sapphire wafer; semiconductor lasers;
                 semiconductor materials; Zn",
  treatment =    "P Practical",
}

@Article{Wieder:1971:CGL,
  author =       "H. Wieder and H. Werlich",
  title =        "Characteristics of {GaAs} laser arrays designed for
                 beam addressable memories",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "272--277",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320Z (Other digital storage)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "10 MHZ; beam addressable memories; EuO film; GaAs
                 laser arrays; magnetic film stores; optical storage
                 devices; read/write operations; semiconductor; storage
                 devices",
  treatment =    "X Experimental",
}

@Article{Huth:1971:DFR,
  author =       "B. G. Huth and M. R. Agan",
  title =        "Dynamics of a flashlamp-pumped rhodamine {6G} laser",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "278--292",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255M (Lasing action in liquids and organic dyes);
                 A4260 (Laser systems and laser beam applications);
                 B4320E (Liquid lasers and organic dye lasers)",
  corpsource =   "IBM, Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "anthracene; computer applications; dye laser;
                 flashlamp pumped rhodamine 6G laser; lifetimes; liquid
                 lasers; model; modelling; organic compounds; stimulated
                 emission; triplet state",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Grant:1971:ISR,
  author =       "P. M. Grant",
  title =        "Interleaving slow and rapid-data-rate experiments with
                 a time-sharing laboratory automation system",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "293--293",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3380D (Control of physical instruments); C7320
                 (Physics and chemistry computing); C7420 (Control
                 engineering computing)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acquisition; computer control; control engineering
                 applications of computers; data; data acquisition;
                 instrumentation; laboratory automation system; time
                 sharing laboratory automation system",
  treatment =    "A Application",
}

@Article{Schechtman:1971:ADA,
  author =       "B. H. Schechtman and P. M. Grant",
  title =        "Automation of data acquisition in transient
                 photoconductive decay experiments",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "296--306",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3380D (Control of physical instruments); C7320
                 (Physics and chemistry computing); C7420 (Control
                 engineering computing)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acquisition; computer aided analysis; computers;
                 control engineering applications of; data; data
                 acquisition; devices; electrostatic copiers; physics;
                 radiation detectors; television imaging; transient
                 photoconductive decay experiments",
}

@Article{Anonymous:1971:ARG,
  author =       "Anonymous",
  title =        "Automation of a residual gas analyzer in a time-shared
                 computer",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "307--312",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3380D (Control of physical instruments); C7320
                 (Physics and chemistry computing); C7420 (Control
                 engineering computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automation in data acquisition; computer aided
                 analysis; computers; control engineering applications
                 of; instrumentation; mass spectrometry; partial
                 pressures of gaseous species; quadrupole mass; residual
                 gas analyzer; shared computer; spectrometer; time",
}

@Article{Kahan:1971:ECC,
  author =       "G. J. Kahan",
  title =        "Equivalent circuit for conductivity-temperature
                 characteristics of the {PdO\slash Ag-Pd} glaze
                 resistor",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "313--317",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2120 (Resistors)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "conductivity/temperature relationship; equivalent
                 circuit; equivalent circuits; materials properties;
                 PdO/Ag-Pd glaze resistor; resistors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Greenberg:1971:IMD,
  author =       "S. G. Greenberg and Y. Bard",
  title =        "An improved method for designing optimal linear
                 compensators",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "318--322",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65L99",
  MRnumber =     "46 \#2881",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "256.93058",
  acknowledgement = ack-nhfb,
  classcodes =   "C1340G (Time-varying control systems)",
  corpsource =   "MIT, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "control; deterministic regulator problem; linear
                 systems; observation noise; optimal control; optimal
                 linear compensators; quadratic cost criteria; Riccati
                 equations; stochastic; stochastic systems; white
                 Gaussian plant",
  reviewer =     "V. Ionescu",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bosarge:1971:SNR,
  author =       "W. E. {Bosarge, Jr.} and C. L. Smith",
  title =        "Some numerical results for iterative continuation in
                 nonlinear boundary-value problems",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "4",
  pages =        "323--327",
  month =        jul,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65N10",
  MRnumber =     "47 \#1303",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "258.65086",
  acknowledgement = ack-nhfb,
  classcodes =   "C4170 (Differential equations)",
  corpsource =   "IBM, Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "boundary-value problems; continuous analogue iterative
                 methods; differential equations; iterative methods;
                 nonlinear; nonlinear boundary; relaxed Newton method;
                 value problems",
  reviewer =     "K. Frankowski",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Oktay:1971:MSB,
  author =       "S. Oktay",
  title =        "Multi-fluid subdued boiling; theoretical analysis of
                 multi-fluid interface bubbles",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "342--354",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6470F (Liquid-vapour transitions)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "boiling; bubbles; change; fluids; heat transfer;
                 immiscible liquids; interface bubble sizes; liquid/air
                 interface; liquid/liquid interface; liquids; multifluid
                 subdued boiling; of state; thermal properties of
                 liquids",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hartwell:1971:PIF,
  author =       "J. W. Hartwell",
  title =        "A procedure for implementing the fast {Fourier}
                 transform on small computers",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "355--363",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65T05",
  MRnumber =     "45 \#6219",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods)",
  corpsource =   "Florida Atlantic Univ., Boca Racton, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; computer; Cooley Tukey; data acquisition;
                 discrete Fourier transform; Fast Fourier Transform;
                 fast Fourier transforms; IBM System/7; real time
                 processing",
  reviewer =     "P. Brock",
  treatment =    "A Application",
}

@Article{Choquet:1971:GSD,
  author =       "M. F. Choquet and H. J. Nussbaumer",
  title =        "Generation of synchronous data transmission signals by
                 digital echo modulation",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "364--377",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120 (Modulation methods)",
  corpsource =   "IBM, Alpes Maritimes, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data transmission techniques; demodulators; digital
                 echo modulation; digitally implemented modem
                 transmitters; frequency shift keying; keying; linear;
                 modulation; modulators; phase shift; vestigial
                 sideband",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shine:1971:AEE,
  author =       "M. C. Shine and F. M. D'Heurle",
  title =        "Activation energy for electromigration in aluminium
                 films alloyed with copper",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "378--383",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6630 (Diffusion in solids); A6855 (Thin film growth,
                 structure, and epitaxy); A6860 (Physical properties of
                 thin films, nonelectronic); A7215 (Electronic
                 conduction in metals and alloys); B2110 (Conductors)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.6 eV; activation energy; Al alloys; aluminium
                 alloys; aluminium films; copper alloys; Cu alloys;
                 diffusion in solids; electrical conductivity;
                 electrical conductivity of solids; electromigration;
                 films; grain boundaries; grain boundary diffusion;
                 resistance measurement; thick films; thin; thin films",
  treatment =    "X Experimental",
}

@Article{Fox:1971:DLC,
  author =       "P. E. Fox and W. J. Nestork",
  title =        "Design of logic circuit technology for {IBM
                 System\slash 370 Models 145} and 155",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "384--390",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1260 (Pulse circuits); B1265 (Digital electronics);
                 C5210 (Logic design methods)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ceramic substrate; circuit; current switch emitter
                 follower; DTL; IBM System/370 models 145 and 155;
                 integrated circuits; logic; logic circuits; logic
                 design; microelectronic circuit; monolithic integrated
                 circuits; monolithic system technology; TTL",
  treatment =    "G General Review",
}

@Article{Irwin:1971:IMT,
  author =       "J. W. Irwin and J. V. Cassie and H. C. Oppeboen",
  title =        "The {IBM 3803\slash 3420} magnetic tape subsystem",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "391--400",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320 (Digital storage)",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "check; computer's central processing; control systems;
                 correction; IBM 3803/3420 magnetic tape subsystem;
                 magnetic tape equipment; microprogram control;
                 monolithic technology; phase error detection and; read
                 only storage control; readback parity; reel control;
                 unit",
  treatment =    "G General Review",
}

@Article{Keyes:1971:TPC,
  author =       "R. W. Keyes",
  title =        "Thermal problems of the {CW} injection laser",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "401--404",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255P (Lasing action in semiconductors); A4260 (Laser
                 systems and laser beam applications); B4320J
                 (Semiconductor lasers)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electrical resistance; properties of substances;
                 resistance; semiconductor continuous wave injection
                 laser; semiconductor junction temperature;
                 semiconductor junctions; semiconductor lasers; thermal;
                 threshold current",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Zappe:1971:UOJ,
  author =       "H. H. Zappe and K. R. Grebe",
  title =        "Ultra-high-speed operation of {Josephson} tunnelling
                 devices",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "405--407",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B3240C (Superconducting junction devices)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "gate switching time; Josephson junctions; Josephson
                 tunnelling devices; logic circuits; memory cell; Pb
                 alloy; SiO; switching systems; tunnelling",
}

@Article{Philipp-Rutz:1971:SWO,
  author =       "E. M. Philipp-Rutz",
  title =        "Synchronization in a wideband optical data
                 transmission system",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "5",
  pages =        "408--412",
  month =        sep,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6260 (Optical links and equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "coding; coincidence detection; data transmission
                 systems; demultiplexer; laser beam; optical links;
                 optical synchronization technique; PCM channels;
                 receiver; synchronisation; technique; transmission
                 system; wideband optical data",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Sitton:1971:DTI,
  author =       "G. A. Sitton",
  title =        "Direct technique for improving a matrix inverse",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "??",
  pages =        "413--417",
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65.35",
  MRnumber =     "44 \#6141",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "266.65027",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. Niethammer",
}

@Article{Vora:1971:SSI,
  author =       "M. B. Vora",
  title =        "A self-isolation scheme for integrated circuits",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "430--435",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cell; double diffusion process; integrated circuits;
                 logic cell; memory; self isolation scheme;
                 semiconductor device manufacture; transistor
                 fabrication; transistors",
  treatment =    "P Practical",
}

@Article{Ghosh:1971:DDU,
  author =       "H. N. Ghosh and K. G. Ashar and A. S. Oberai and D.
                 Dewitt",
  title =        "Design and development of an ultralow-capacitance,
                 high-performance pedestal transistor",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "436--442",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560J (Bipolar transistors)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "collector base junction; collector series resistance;
                 high current densities; high performance
                 characteristics; highly doped collector region; large
                 impurity gradient; low; pedestal; planar IC process;
                 small geometries; transistor; transistor structure;
                 transistors; ultra low capacitance",
  treatment =    "P Practical; X Experimental",
}

@Article{Anantha:1971:PMS,
  author =       "N. G. Anantha and K. G. Ashar",
  title =        "Planar mesa {Schottky} barrier diode",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "442--445",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560H (Junction and barrier diodes)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "characteristics; high breakdown voltages; mesa
                 Schottky diodes; planar silicon technology; processing
                 techniques; Schottky-barrier diodes; semiconductor
                 device manufacture",
  treatment =    "P Practical",
}

@Article{Magdo:1971:EBF,
  author =       "S. Magdo and C. H. Ting and M. Hatzakis",
  title =        "Electron beam fabrication of micron transistors",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "446--451",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560J (Bipolar transistors); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar transistors; components in integrated
                 circuits; dc and ac characteristics; electron beam;
                 experimental process; exposure; fabrication process;
                 guide for refinement; high; high speed performances;
                 integrated circuit production; micron transistor
                 design; packing density; semiconductor device
                 manufacture; small transistor fabrication",
  treatment =    "P Practical",
}

@Article{Ziegler:1971:EEH,
  author =       "J. F. Ziegler and B. L. Crowder and W. J.
                 Kleinfelder",
  title =        "Experimental evaluation of high energy ion
                 implantation gradients for possible fabrication of a
                 transistor pedestal collector",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "452--456",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520 (Thin film growth); B2550B (Semiconductor
                 doping); B2550 (Semiconductor device technology);
                 B2560J (Bipolar transistors)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "boron; characteristics; collector pedestal
                 fabrication; concentration gradients; high energy ion
                 implantation; high speed switching; ion implantation;
                 phosphorus; semiconductor doping; transistor;
                 transistors",
  treatment =    "X Experimental",
}

@Article{Ghosh:1971:AES,
  author =       "H. N. Ghosh and A. S. Oberai and M. B. Vora and J. J.
                 Chang",
  title =        "An arsenic emitter structure for high-performance
                 silicon transistors",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "457--463",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560J (Bipolar transistors)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arsenic emitter structure; arsenic process; bipolar
                 silicon; bipolar transistors; crystal defects; devices;
                 diffusion depth; high density; high performance; lower;
                 sheet conductivity; silicon; small geometry; steeper
                 gradient; surface concentration; transistors",
  treatment =    "X Experimental",
}

@Article{Sandhu:1971:ASV,
  author =       "J. S. Sandhu and J. L. Reuter",
  title =        "Arsenic source vapour pressure kinetics and capsule
                 diffusion",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "464--471",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6630 (Diffusion in solids); A7220 (Electrical
                 conductivity phenomena in semiconductors and
                 insulators); A7280C (Conductivity of elemental
                 semiconductors); B2550 (Semiconductor device
                 technology)",
  corpsource =   "Cogar Corp., Wappingers Falls, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "capsule diffusion; diffusion; diffusion in solids;
                 elemental semiconductors; homogenized preparation;
                 kinetics of arsenic vapor pressure; measurement; role
                 of vapor pressure; semiconductor materials; SiAs source
                 material; silicon",
  treatment =    "P Practical",
}

@Article{Chiu:1971:DMA,
  author =       "T. L. Chiu and H. N. Ghosh",
  title =        "A diffusion model for arsenic in silicon",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "472--476",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); C7320
                 (Physics and chemistry computing)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arsenic diffusion; computer program; diffusion;
                 physics; profiles; semiconductor materials; silicon",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ruehli:1971:NCM,
  author =       "A. E. Ruehli and D. M. Ellis",
  title =        "Numerical calculation of magnetic fields in the
                 vicinity of a magnetic body",
  journal =      j-IBM-JRD,
  volume =       "15",
  number =       "6",
  pages =        "478--482",
  month =        nov,
  year =         "1971",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0755 (Magnetic instruments and techniques); C4190
                 (Other numerical methods)",
  corpsource =   "IBM, Burlington, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "calculation; constant permeability; different
                 thicknesses; integral equation approach; integral
                 equations; magnetic fields; methods; numerical; of
                 magnetic body; physics; rectangular body; static
                 magnetic fields; vicinity",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Collins:1972:SPT,
  author =       "R. H. Collins and E. G. Grochowski and W. D. North",
  title =        "Silicon process technology for monolithic memory",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "2--10",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560Z (Other semiconductor devices); B2570
                 (Semiconductor integrated circuits); C5320G
                 (Semiconductor storage)",
  corpsource =   "IBM, East Fishkill, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crystal orientation; good junction; high speed
                 circuits; improved gain at low current; integrated
                 circuits; larger starting; monolithic integrated
                 circuits; monolithic memory; quality; semiconductor
                 device manufacture; semiconductor materials;
                 semiconductor storage devices; Si process technology;
                 substrates",
  treatment =    "N New Development; P Practical",
}

@Article{Ahearn:1972:DII,
  author =       "G. R. Ahearn and Y. Dishon and R. N. Snively",
  title =        "Designs innovations of the {IBM} 3830 and 2835 storage
                 control units",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "11--18",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer architecture; Disk Storage; IBM 2305 Fixed
                 Head Storage; IBM 3330; magnetic storage systems;
                 storage; storage control units; units",
  treatment =    "N New Development; P Practical",
}

@Article{Brown:1972:RPA,
  author =       "B. R. Brown",
  title =        "Readout performance analysis of a cryogenic
                 magneto-optical data storage system",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "19--26",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120N (Magnetic thin film devices); B3240
                 (Superconducting devices); B4160 (Magneto-optical
                 devices); C5320Z (Other digital storage)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "beam addressable file model; cryoelectric stores;
                 cryogenic; cryogenic magneto optical data storage
                 system; cryogenics; Curie point; doped; EuQ film;
                 Faraday readout; film stores; GaAs injection lasers;
                 laser beam; magnetic; magnetic film stores; magnetic
                 storage devices; magnetic thin film devices; magneto
                 optical film; magneto-optical effects; noise; noise
                 generation; optical stores; readout performance
                 analysis; readout signal; writing",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Jones:1972:TDD,
  author =       "R. E. {Jones, Jr.}",
  title =        "Theories of the distribution of deposit from sputtered
                 disk and rectangular electrodes",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "27--34",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2320 (Electron emission, materials and cathodes)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "additional emission; cosine emission law; disk and
                 rectangular electrodes; distorted inward; distribution
                 of deposit; electrodes; emission; film deposit;
                 sputtering; under cosine emission; uniform emission",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Jutzi:1972:CTS,
  author =       "W. Jutzi and C. H. Schuenemann",
  title =        "Cross-coupled thyristor storage cell",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "35--44",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2560J (Bipolar
                 transistors); B2560Z (Other semiconductor devices);
                 B2570 (Semiconductor integrated circuits); C5320G
                 (Semiconductor storage)",
  corpsource =   "IBM, Zurich, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cross coupled thyristor storage cell; integrated
                 circuits; lateral pnp transistor; semiconductor storage
                 devices; Si planar technology; symmetrical; thyristor
                 applications; vertical npn transistor",
  treatment =    "P Practical",
}

@Article{Hassitt:1972:EEA,
  author =       "A. Hassitt and L. E. Lyon",
  title =        "Efficient evaluation of array subscripts of arrays",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "45--57",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; array subscripts of arrays; compilers; efficient
                 evaluation; language; languages; multiple subscripts;
                 procedure oriented; procedure oriented languages;
                 program compilers; selection operations",
  treatment =    "P Practical",
}

@Article{Hatfield:1972:EPS,
  author =       "D. J. Hatfield",
  title =        "Experiments on page size, program access patterns, and
                 virtual memory performance",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "58--66",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6130 (Data handling
                 techniques)",
  corpsource =   "IBM, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "localized use of memory space; page management; page
                 size; paging; program access patterns; simulators;
                 storage allocation; Storage allocation; time for access
                 and software; virtual memory performance",
  treatment =    "X Experimental",
}

@Article{Maissel:1972:SHS,
  author =       "L. I. Maissel and C. L. Standley and L. V. Gregor",
  title =        "Sputter-etching of heterogeneous surfaces",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "67--70",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2180 (Electrical contacts); B2220 (Integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "catcher; control of; etching; heterogeneous surfaces;
                 redeposition; reemitted particles; sputter etching;
                 sputtering; sputtering chamber; trapping",
  treatment =    "P Practical; X Experimental",
}

@Article{Silvestri:1972:GER,
  author =       "V. J. Silvestri and T. B. Light and H. N. Yu and A.
                 Reisman",
  title =        "{Ge} epitaxial refill deposition techniques for
                 fabricating pedestal transistor structures",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "1",
  pages =        "71--5",
  month =        jan,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220 (Integrated circuits); B2550G (Lithography);
                 B2560J (Bipolar transistors); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar transistors; capacitance; deposited SiQ/sub 2/
                 mask; electrical; epitaxial growth; etch epitaxial
                 technique; fabricating pedestal transistor structures;
                 Ge epitaxial refill deposition techniques; integrated
                 circuits; junction characteristics; low parasitic; of
                 semiconductors; properties; ridge minimizing; selective
                 deposition; semiconductor device manufacture",
  treatment =    "P Practical",
}

@Article{Abraham:1972:MTR,
  author =       "F. F. Abraham and R. N. Kortzeborn and H. G. Kolsky
                 and S. K. Jordan",
  title =        "Model for time-dependent raindrop size distributions;
                 application to the washout of airborne contaminants",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "91--100",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9260 (Lower atmosphere); B7710B (Atmospheric,
                 ionospheric and magnetospheric techniques and
                 equipment)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "airborne particles; atmospheric profile; atmospherics;
                 coalescence; drops; modelling; rain; raindrop size
                 distributions; terrestrial atmosphere; washout
                 process",
  treatment =    "P Practical",
}

@Article{Botkin:1972:RLA,
  author =       "D. B. Botkin and J. F. Janak and J. R. Wallis",
  title =        "Rationale, limitations, and assumptions of a
                 northeastern forest growth simulator",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "101--116",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7890 (Other special applications of computing)",
  corpsource =   "Yale Univ. New Haven, CT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "agriculture; computer program; forest growth
                 simulator; program parameters; simulation; site
                 quality; soil moisture storage",
  treatment =    "P Practical",
}

@Article{Freeze:1972:SHA,
  author =       "R. A. Freeze",
  title =        "Subsurface hydrology at waste disposal sites",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "117--129",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9190 (Other topics in solid Earth physics); B7710
                 (Geophysical techniques and equipment)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Earth; flow of liquids; formations; geologic; ground
                 based waste disposal; groundwater flow systems;
                 hydrochemical reactions; liquid wastes; mathematical
                 model; modelling; pollution; soil; soil moisture;
                 subsurface pollution; surface water pollution; waste
                 lagoons",
  treatment =    "P Practical",
}

@Article{Gambolati:1972:ESV,
  author =       "G. Gambolati",
  title =        "Estimate of subsidence in {Venice} using a
                 one-dimensional model of the subsoil",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "130--137",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9190 (Other topics in solid Earth physics)",
  corpsource =   "IBM, San Polo, Venice, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "artificial wells; Earth; extraction; Lagoon; land
                 subsidence; modelling; piezometric level; soil;
                 Venetian; vertical consolidation; water",
  treatment =    "P Practical",
}

@Article{Nagy:1972:NCC,
  author =       "G. Nagy and J. Tolaba",
  title =        "Nonsupervised crop classification through airborne
                 multispectral observations",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "138--153",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B7630 (Avionic systems and aerospace
                 instrumentation)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "accuracy; aerospace instrumentation; agriculture;
                 categorizer; clustering algorithm; parameters; primary
                 sampling units; terrain classification; training sets",
  treatment =    "P Practical",
}

@Article{Peterson:1972:ICG,
  author =       "T. I. Peterson and P. N. Wahi",
  title =        "Interactive computer-based game for decision-making in
                 ecology",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "154--161",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7490 (Computing in other engineering fields)",
  corpsource =   "IBM, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computers; computing, management science; decision
                 making; decision theory and analysis; Ecology Decision
                 Game; engineering applications of; game theory;
                 learning; management science; maximal flow; solid waste
                 management; transportation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shieh:1972:AQD,
  author =       "L. J. Shieh and P. K. Halpern and B. A. Clemens and H.
                 H. Wang and F. F. Abraham",
  title =        "Air quality diffusion model: application to {New York
                 City}",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "162--170",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4160 (Numerical integration and differentiation)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air pollution diffusion model; air quality;
                 formulation; Gaussian plume; integration; modelling;
                 numerical methods; pollution; source strengths",
  treatment =    "P Practical; X Experimental",
}

@Article{Shir:1972:NIA,
  author =       "C.-C. Shir",
  title =        "Numerical investigation of the atmospheric dispersion
                 of stack effluents",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "171--178",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4170 (Differential equations)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "atmospheric dispersion; finite difference method;
                 gradient transfer theory; numerical method; numerical
                 methods; partial differential equations; pollutant
                 concentration; pollution; stack effluents; temperature
                 profiles; wind",
  treatment =    "P Practical; X Experimental",
}

@Article{Braslau:1972:OEC,
  author =       "N. Braslau",
  title =        "Overlap emissivity of {CO$_2$} and {H}$_2$\slash {O}
                 in the 15- mu m spectral region",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "180--183",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9260 (Lower atmosphere)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "absorption; atmospheric composition; atmospheric
                 spectra; computer simulation; emissivity; mean
                 temperature; model atmospheres; pressure; radiative
                 transfer; spectra; spectral calculation; temperature;
                 water vapour",
}

@Article{Heller:1972:MCT,
  author =       "L. G. Heller and W. H. Chang and A. W. Lo",
  title =        "A model of charge transfer in bucket brigade and
                 charge-coupled devices",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "2",
  pages =        "184--187",
  month =        mar,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM, Burlington, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bucket brigade; charge coupled devices; charge motion;
                 electrode fringe field; field effect devices; induced
                 drift; metal-insulator-semiconductor devices;
                 modelling; self; thermal diffusion",
  treatment =    "P Practical",
}

@Article{Chen:1972:MFA,
  author =       "W. T. Chen and T. F. Flavin",
  title =        "Mechanics of film adhesion: Elastic and
                 elastic-plastic behavior",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "203--213",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A6860 (Physical properties of thin films,
                 nonelectronic); A8100 (Materials science); B0530
                 (Metals and alloys (engineering materials science));
                 B0560 (Polymers and plastics (engineering materials
                 science))",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; analytical model of steady state peeling;
                 elastic peel films; elastic plastic behaviour; films;
                 mechanics of film adhesion; rigid substrate; thin
                 films; viscoelastic adhesive",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Baumann:1972:VBC,
  author =       "G. W. Baumann",
  title =        "Viscoelastic behavior of computer tape subjected to
                 periodic motion",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "214--221",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0670H (Display, recording, and indicating
                 instruments); A4630J (Viscoelasticity, plasticity,
                 viscoplasticity, creep, and stress relaxation); C4290
                 (Other computer theory); C5320C (Storage on moving
                 magnetic media)",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "behaviour; boundary conditions; computation theory;
                 computer tape subjected to periodic motion; high
                 performance; impedance techniques; longitudinal motion;
                 magnetic tape storage; mechanical; one dimensional wave
                 equations; periodic reflected waves; recording; simple
                 reflected harmonic waves; simple unreflected harmonic
                 waves; tape drives; travelling velocity stress wave
                 reflections; vibrations; viscoelastic; viscoelasticity;
                 waveform analysis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bishop:1972:DCS,
  author =       "R. E. Bishop and C. C. Wilson",
  title =        "Dynamic control of spring-driven mechanisms",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "222--230",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B7320E (Velocity, acceleration and rotation
                 measurement); C3120E (Velocity, acceleration and
                 rotation control); C3260G (Hydraulic and pneumatic
                 control equipment)",
  corpsource =   "IBM, Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acceleration control; cylinder; deceleration; dynamic
                 control; mechanical control equipment; pneumatic
                 control equipment; single pneumatic; spring driven
                 mechanisms; velocity control",
  treatment =    "A Application; P Practical",
}

@Article{Beaty:1972:ICS,
  author =       "D. A. Beaty and T. A. Hoskins and T. H. Richards and
                 H. W. Simpson",
  title =        "{IBM} copier scanning system",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "231--238",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B5100 (Electric and magnetic fields)",
  corpsource =   "IBM, Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; continuously moving; design considerations;
                 electrostatic devices; electrostatic image; IBM copier
                 scanning system; image drum; instrumentation;
                 photoconductor; simulation",
  treatment =    "P Practical",
}

@Article{Zable:1972:SDC,
  author =       "J. L. Zable and J. C. Yarrington",
  title =        "Some design considerations for a document sorting
                 machine",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "239--248",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C3320 (Control applications to materials handling)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design considerations; document sorting machine;
                 graphical design techniques; indexing time; materials
                 handling; response time; selector",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Peterson:1972:ASA,
  author =       "R. H. Peterson and A. D. Ackerman and R. E. Zelenski",
  title =        "Acoustic signal analysis for noise source
                 identification in mechanisms",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "249--257",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4350 (Acoustic noise, its effects and control); B7210
                 (Instrumentation and measurement systems); B7800
                 (Sonics and ultrasonics)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acoustic noise; acoustic signal analysis; acoustic
                 variables measurement; analyzer; frequency; frequency
                 characteristics; identification; mechanical equipment;
                 noise source; real time analogue digital signal;
                 resolution",
  treatment =    "A Application; P Practical",
}

@Article{Wilson:1972:HID,
  author =       "A. D. Wilson and D. H. Strope",
  title =        "Holographic interferometry deformation study of a
                 printer type-piece",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "258--268",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0340D (Mathematical theory of elasticity); A0760L
                 (Optical interferometry); A4210J (Optical interference
                 in homogeneous media); A4220 (Optical propagation and
                 transmission in inhomogeneous media); A4240
                 (Holography); A4630C (Elasticity)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Cubic spline; deformation study; effects of impact
                 velocity; elastic deformation; holographic; holography;
                 interferometry; light interferometry; methods; print
                 hammer impact; pulsed ruby laser; stress analysis;
                 stress information; type piece twisting",
  treatment =    "X Experimental",
}

@Article{Lin:1972:AWL,
  author =       "C. Lin and R. F. Sullivan",
  title =        "An application of white light interferometry in thin
                 film measurements",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "269--276",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4210 (Optical propagation and transmission in
                 homogeneous media); A4220 (Optical propagation and
                 transmission in inhomogeneous media); B7100
                 (Measurement science); B7200 (Measurement equipment and
                 instrumentation systems); B7320C (Spatial variables
                 measurement)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air films; air lubricated slider bearings; colour
                 spectrum interference pattern; continuous; distance
                 measurement; equipment; films; light interferometry;
                 magnetic disk; measurement; micrometers; resolution
                 0.05; thickness; thin film thickness measurement; thin
                 films; white light interferometry",
  treatment =    "A Application; X Experimental",
}

@Article{White:1972:RNI,
  author =       "J. W. White",
  title =        "Removal of numerical instability in the solution of
                 nonlinear heat exchange equations",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "277--282",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0260 (Numerical approximation and analysis); A4400
                 (Heat flow, thermal and thermodynamic processes);
                 A4725Q (Convection and heat transfer); C4170
                 (Differential equations)",
  corpsource =   "IBM, Winston-Salem, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; coefficient matrices; diagonal dominance;
                 evolution technique; Gauss Seidel system relaxation
                 method; heat transfer; Newton Raphson root; nonlinear
                 differential equations; nonlinear heat exchange
                 equations; numerical; numerical instability; physics;
                 relaxation methods; solution of",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Randolph:1972:DFH,
  author =       "J. B. Randolph and F. K. King",
  title =        "Design and fabrication of heat transfer surfaces from
                 superplastic material",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "283--291",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170G (General fabrication techniques)",
  corpsource =   "IBM, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; fabrication; flow friction test data; forming
                 processes; heat sinks; heat transfer surfaces;
                 material; plastics; superplastic; superplastic sheet
                 thermoforming process; surface",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Paivanas:1972:STP,
  author =       "J. A. Paivanas",
  title =        "Stationary temperature profiles and heat flux
                 distribution in a plastic-encapsulated circuit
                 package",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "292--302",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2220 (Integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adiabatic assumptions; axisymmetrical analysis; chip
                 to lead thermal circuits; dimensional analysis;
                 encapsulation; flux distribution; heat; heat
                 dissipation mechanisms; integrated circuits; junction
                 heat; linear differential equations; one; plastic
                 encapsulated ICs; plastic to wire thermal circuits;
                 profiles; sources of equal strength; stationary
                 temperature profiles; structural integrity; thermal
                 effects; two dimensional temperature",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lindsted:1972:AET,
  author =       "R. D. Lindsted and D. A. DiCicco",
  title =        "Analytical and experimental thermal analysis of
                 multiple heat sources in integrated semiconductor
                 chips",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "303--306",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570 (Semiconductor integrated circuits)",
  corpsource =   "Wichita State Univ. KS, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analytical model; effects; experimental thermal
                 analysis; integrated circuits; integrated semiconductor
                 chips; junction temperatures; multiple heat sources;
                 semiconductor device models; thermal",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Crispi:1972:MMD,
  author =       "F. J. Crispi and G. C. {Maling, Jr.} and A. W. Rzant",
  title =        "Monitoring microinch displacements in ultrasonic
                 welding equipment",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "307--312",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4390 (Other topics in acoustics); B7820 (Sonic and
                 ultrasonic applications); B8620 (Power applications in
                 manufacturing industries)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0 to 0.030 inches at LF; 5 to 5000 microinch below 100
                 KHz; acoustic probe; acoustic variables measurement;
                 acoustical technique; fiber optic probe; fine;
                 instruments; length measurement; light reflecting
                 scheme; microinch displacement monitoring;
                 noncontacting techniques; optical; ultrasonic
                 equipment; ultrasonic welding equipment; welding
                 equipment",
  treatment =    "X Experimental",
}

@Article{Patlach:1972:DCM,
  author =       "A. M. Patlach",
  title =        "Design considerations for a magneto-optic cryogenic
                 film memory",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "3",
  pages =        "313--319",
  month =        may,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320Z (Other digital storage)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bearing technology; cryotrons; design considerations;
                 Fe doped EuO; magnetic storage devices; magnetooptic
                 cryogenic film memory; operating; optical storage
                 devices; rotating disk file configuration; technology;
                 temperature below 100 degrees Kelvin; vacuum",
  treatment =    "G General Review",
}

@Article{Liniger:1972:SAA,
  author =       "W. Liniger and F. Odeh",
  title =        "{$A$}-stable, accurate averaging of multistep methods
                 for stiff differential equations",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "335--348",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 17:21:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290P (Differential equations); C4170 (Differential
                 equations)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "A-stable; accurate averaging of multistep methods;
                 algorithmic; computationally efficient; differential
                 equations; higher-order solutions; implementation;
                 linear combinations; numerical methods; parameters;
                 repeated integration; stiff; test problems",
  reviewer =     "J. C. Butcher",
  treatment =    "X Experimental",
}

@Article{Gourlay:1972:HDM,
  author =       "A. R. Gourlay and J. Ll. Morris",
  title =        "Hopscotch difference methods for nonlinear hyperbolic
                 systems",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "349--353",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65M05",
  MRnumber =     "49 \#11820",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290P (Differential equations); C4170 (Differential
                 equations)",
  corpsource =   "IBM, Peterlee, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "damping of; differential equations; first; hopscotch
                 algorithm; hopscotch Lax Wendroff schemes; maximum
                 stability; nonlinear differential equations; numerical
                 integration; numerical methods; order nonlinear
                 hyperbolic systems; partial; partial differential
                 equations; pseudoviscous term; shocks",
  reviewer =     "J. C. Butcher",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Canosa:1972:PSM,
  author =       "Jos{\'e} Canosa and H. R. Penafiel",
  title =        "Parallel shooting method for boundary-value problems:
                 application to the neutron transport equation",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "354--364",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65L10",
  MRnumber =     "48 \#7610",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0260 (Numerical approximation and analysis); A2820
                 (Neutron physics); B0290P (Differential equations);
                 C4170 (Differential equations)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Boltzmann equation; boundary value problems;
                 boundary-value problems; computation; differential;
                 equations; geometry; matrix transformations; neutron
                 transport equations; neutron transport theory;
                 numerical methods; parallel shooting method; roundoff
                 instability; slab; spherical harmonics approximation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Alsop:1972:FDF,
  author =       "L. E. Alsop and A. S. Goodman",
  title =        "Finite difference formulas for {Neumann} conditions on
                 irregularly shaped boundaries",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "365--371",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65N05",
  MRnumber =     "48 \#10142",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290P (Differential equations); C4170 (Differential
                 equations)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "90; and -independent; boundary-value problems; degree
                 corner; difference equations; elastic surface wave;
                 finite difference formulas; finite element techniques;
                 irregularly; methods; Neumann conditions; numerical;
                 numerical computation; partial differential equations;
                 propagation; shaped boundaries; time-dependent",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Micchelli:1972:TFH,
  author =       "C. A. Micchelli and T. J. Rivlin",
  title =        "{Tur{\'a}n} formulae and highest precision quadrature
                 rules for {Chebyshev} coefficients",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "372--379",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D30",
  MRnumber =     "48 \#12784",
  bibdate =      "Tue Mar 6 17:23:39 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290M (Numerical integration and differentiation);
                 C4160 (Numerical integration and differentiation)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Chebyshev coefficients; highest precision quadrature
                 rules; integration; numerical analysis; polynomials;
                 Turan formulae",
  reviewer =     "C. A. Hall",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chen:1972:ACE,
  author =       "Tien Chi Chen",
  title =        "Automatic Computation of Exponentials, Logarithms,
                 Ratios and Square Roots",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "380--388",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D20",
  MRnumber =     "49 \#1738",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "ftp://garbo.uwasa.fi/pc/doc-soft/fpbibl18.zip;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://www.research.ibm.com/journal/rd/164/chen.pdf",
  abstract =     "It is shown how a relatively simple device can
                 evaluate exponentials, logarithms, ratios and square
                 roots for fraction arguments, employing only shifts,
                 adds, high-speed table lookups, and bit counting. The
                 scheme is based on the cotransformation of a number
                 pair $(x, y)$ such that the $F(x, y) = f(x_0)$ is
                 invariant; when $x$ is driven towards a known value
                 $x_w$, $y$ is driven towards the result. For an $N$-bit
                 fraction about $N / 4$ iterations are required, each
                 involving two or three adds; then a termination
                 algorithm, based on an add and an abbreviated multiply,
                 completes the process, for a total cost of about one
                 conventional multiply time. Convergence, errors and
                 simulation using APL are discussed.",
  acknowledgement = ack-nhfb # " and " # ack-nj,
  classcodes =   "C5230 (Digital arithmetic methods)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adds; APL; bit counting; convergence;
                 cotransformation; digital arithmetic; errors;
                 exponentials; high speed table; iteration; logarithms;
                 lookups; ratios; shifts; simulation; square roots;
                 termination algorithm",
  reviewer =     "F. Gotze",
  treatment =    "P Practical",
}

@Article{Miranker:1972:EIS,
  author =       "W. L. Miranker",
  title =        "Enveloping an iteration scheme",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "389--392",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65F10",
  MRnumber =     "49 \#10132",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290H (Linear algebra); C4140 (Linear algebra)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "enveloping; iteration; iterative methods; linear;
                 matrix algebra; optimal values; optimisation;
                 relaxation parameters; second order method",
  reviewer =     "D. M. Young, Jr.",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bosarge:1972:NPM,
  author =       "W. E. {Bosarge, Jr.} and C. L. Smith",
  title =        "Numerical properties of a multivariate {Ritz--Trefftz}
                 method",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "393--400",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65N30",
  MRnumber =     "49 \#1798",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290F (Interpolation and function approximation);
                 C1340J (Distributed parameter control systems); C4130
                 (Interpolation and function approximation)",
  corpsource =   "IBM, Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "band structure; computer implementation; continuous
                 approximations; definiteness; distributed parameter
                 systems; linear parabolic regulator problem;
                 multivariate splines; numerical properties; Ritz;
                 splines (mathematics); Trefftz algorithm",
  reviewer =     "Hansgeorg Jeggle",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Numerical properties of a multivariable
                 {Ritz--Trefftz} method",
}

@Article{Rissanen:1972:REP,
  author =       "J. Rissanen",
  title =        "Recursive evaluation of {Pad{\'e}} approximants for
                 matrix sequences",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "401--406",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D15",
  MRnumber =     "49 \#1736",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290H (Linear algebra); C4140 (Linear algebra)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; approximants; inverse of the characteristic
                 matrix; matrix algebra; matrix sequences; minimal;
                 numerical analysis; Pade; polynomial; polynomials;
                 recursive evaluation",
  reviewer =     "Gerhard Merz",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wolfe:1972:CGM,
  author =       "Philip Wolfe",
  title =        "On the convergence of gradient methods under
                 constraint",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "407--411",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "49D10 (65K05)",
  MRnumber =     "48 \#9511",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0260 (Optimisation techniques); C1180 (Optimisation
                 techniques)",
  corpsource =   "IBM Thomas J. Watson, Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "convergence of gradient methods; convergence of
                 numerical methods; example; inequality constraints;
                 mathematical programming; maximizing; theorem",
  reviewer =     "V. Komkov",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hoffman:1972:FAS,
  author =       "A. J. Hoffman and S. Winograd",
  title =        "Finding all shortest distances in a directed network",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "412--414",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "49 \#10454",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290H (Linear algebra); C4140 (Linear algebra)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; directed network; matrix algebra; numerical
                 analysis; shortest distances",
  reviewer =     "W.-K. Chen",
  treatment =    "P Practical",
}

@Article{Tomlin:1972:MSI,
  author =       "J. A. Tomlin",
  title =        "Maintaining a sparse inverse in the simplex method",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "415--423",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90C05",
  MRnumber =     "48 \#7966",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0260 (Optimisation techniques); C1180 (Optimisation
                 techniques)",
  corpsource =   "Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "advantages; analytical comparison; elimination form
                 of; inverse; linear; linear programming; programming;
                 simplex method; sparse inverse; sparse matrices;
                 sparseness; speed",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Guignard:1972:MAK,
  author =       "M. M. Guignard and K. Spielberg",
  title =        "Mixed-integer algorithms for the (0,1) knapsack
                 problems",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "424--430",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0260 (Optimisation techniques); C1180 (Optimisation
                 techniques)",
  corpsource =   "Univ. Lille, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "comparative study; computational results; enumerative
                 algorithms; inequalities; integer programming; knapsack
                 problem; mixed integer algorithms; search procedures;
                 state enumeration",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Guignard:1972:MNC,
  author =       "M. M. Guignard and K. Spielberg",
  title =        "Mixed-integer algorithms for the $(0,\,1)$ knapsack
                 problem",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "??",
  pages =        "424--430",
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90C10",
  MRnumber =     "48 \#7970",
  bibdate =      "Wed Dec 4 15:59:35 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Crowder:1972:LCC,
  author =       "Harlan Crowder and Philip Wolfe",
  title =        "Linear convergence of the conjugate gradient method",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "431--433",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65K05",
  MRnumber =     "48 \#10103",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0260 (Optimisation techniques); C1180 (Optimisation
                 techniques)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "conjugate gradient method; continued method;
                 convergence of numerical methods; convex; general
                 nonlinear function; linear convergence; mathematical
                 programming; nonlinear function; quadratic function;
                 restarted method",
  reviewer =     "James T. Wong",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Brent:1972:DBM,
  author =       "R. P. Brent",
  title =        "On the {Davidenko-Branin} Method for Solving
                 Simultaneous Nonlinear Equations",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "4",
  pages =        "434--436",
  month =        jul,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65H10",
  MRnumber =     "48 \#12817",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Mathematics of numerical computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290K (Nonlinear and functional equations); C4150
                 (Nonlinear and functional equations)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "convergence of numerical methods; convergent;
                 Davidenko Branin method; example; function
                 minimization; globally; homeomorphic to; hyperplanes;
                 nlop; nonlinear equations; simultaneous nonlinear
                 equations",
  reviewer =     "N. N. Abdelmalek",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Burge:1972:CPC,
  author =       "W. H. Burge",
  title =        "Combinatory programming and combinatorial analysis",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "450--461",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(mathematical); combinatorial analysis; combinatorial
                 mathematics; combinatorial theory; programming
                 techniques; programming theory; topology; trees",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Herz:1972:RCP,
  author =       "J. C. Herz",
  title =        "Recursive computational procedure for two-dimensional
                 stock cutting",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "462--469",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B05 (90C50)",
  MRnumber =     "53 \#10220",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7490 (Computing in other engineering fields)",
  corpsource =   "IBM Paris Sci. Centre, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cutting; engineering applications of computers;
                 optimisation; procedure; recursive computational; two
                 dimensional stock cutting",
  reviewer =     "F. Giannessi",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ruehli:1972:ICC,
  author =       "A. E. Ruehli",
  title =        "Inductance calculations in a complex integrated
                 circuit environment",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "470--481",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2140 (Inductors and transformers); B2180E
                 (Connectors); B2220 (Integrated circuits); B2570
                 (Semiconductor integrated circuits)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complex integrated circuit environment; design;
                 inductance; inductances; integrated circuits;
                 multiloop",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Billingsley:1972:EUS,
  author =       "D. S. Billingsley",
  title =        "Existence and uniqueness of the solution to
                 {Holland}'s equations for a class of multicolumn
                 distillation systems",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "??",
  pages =        "482--488",
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65H10",
  MRnumber =     "49 \#1762",
  bibdate =      "Tue Sep 11 16:26:07 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  reviewer =     "W. C. Rheinboldt",
}

@Article{Myers:1972:COC,
  author =       "H. J. Myers",
  title =        "Compiling optimized code from decision tables",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "489--503",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "decision tables; optimisation; procedural code
                 conversion; program compilers; reviews",
  treatment =    "G General Review",
}

@Article{Branin:1972:WCM,
  author =       "F. H. {Branin, Jr.}",
  title =        "Widely convergent method for finding multiple
                 solutions of simultaneous nonlinear equations",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "504--522",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65H10",
  MRnumber =     "54 \#6488",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290K (Nonlinear and functional equations); C4150
                 (Nonlinear and functional equations)",
  corpsource =   "IBM, Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "convergent method; differential equations; multiple
                 solutions; nonlinear equations; numerical methods;
                 simultaneous nonlinear equations; widely",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pugacz-Muraszkiewicz:1972:DDP,
  author =       "I. J. Pugacz-Muraszkiewicz",
  title =        "Detection of discontinuities in passivating layers on
                 silicon by {NaOH} anisotropic etch",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "523--529",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7360H (Electronic properties of insulating thin
                 films); A8115 (Methods of thin film deposition); A8160
                 (Corrosion, oxidation, etching, and other surface
                 treatments); B0520 (Thin film growth); B2550
                 (Semiconductor device technology)",
  corpsource =   "IBM, Burlington, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "defects; discontinuities detection; etching; glass;
                 insulating thin films; passivating layers; quartz;
                 semiconductor; silicon; sodium compounds; sputtering;
                 thermally grown oxide films; thin films",
  treatment =    "X Experimental",
}

@Article{Ziegler:1972:NBA,
  author =       "J. F. Ziegler and M. Berkenblit and T. B. Light and K.
                 C. Park and A. Reisman",
  title =        "Nuclear backscattering analysis of {Nb--Nb$_2$\slash
                 O$_5$--Bi} structure",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "5",
  pages =        "530--535",
  month =        sep,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340R (Metal-insulator-metal structures); B2180B
                 (Relays and switches); B2530G (Metal-insulator-metal
                 and metal-semiconductor-metal structures)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "metal-insulator-metal structures; niobium compounds;
                 particle backscattering; semiconductor switches;
                 thermal effects; thin films",
  treatment =    "P Practical",
}

@Article{Ungerbroeck:1972:TSC,
  author =       "G. Ungerbroeck",
  title =        "Theory on the speed of convergence in adaptive
                 equalizers for digital communications",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "546--555",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6240Z (Other transmission line links)",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adaptive; convergence; convergence properties; digital
                 communication; digital communication systems;
                 distortion; electric; equalisers; mean square
                 distortion; telephone networks",
  treatment =    "P Practical",
}

@Article{Sha:1972:NCA,
  author =       "R. T. Sha and D. T. Tang",
  title =        "A new class of automatic equalizers",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "556--566",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6240 (Transmission line links and equipment)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic control; automatic equalisers; distortion;
                 electric distortion; equalisers; fast convergence;
                 feedback; iterative procedure; truncation error",
  treatment =    "P Practical",
}

@Article{Moore:1972:CMC,
  author =       "F. R. Moore",
  title =        "Computational model of a closed queuing network with
                 exponential servers",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "567--572",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1220 (Simulation, modelling and identification)",
  corpsource =   "IBM Corp. Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "closed queuing network; Gordon and Newell approach;
                 modelling; multiserver queueing station; networks;
                 queueing theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Michaud:1972:EIE,
  author =       "P. Michaud",
  title =        "Exact implicit enumeration method for solving the set
                 partitioning problem",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "573--578",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "418.05007",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); C1160
                 (Combinatorial mathematics)",
  corpsource =   "IBM World Trade Corp., Paris, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "exact implicit enumeration method; set partitioning
                 problem; set theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pool:1972:OSA,
  author =       "J. A. van der Pool",
  title =        "Optimum storage allocation for initial loading of a
                 file",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "??",
  pages =        "579--586",
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "403.68033",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{vanderPool:1972:OSA,
  author =       "J. A. {van der Pool}",
  title =        "Optimum Storage Allocation for Initial Loading of a
                 File",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "579--586",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "IBM Nederland, Amsterdam, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "access storage device; direct; file; file
                 organisation; initial loading; optimisation; optimum
                 storage allocation; storage allocation;
                 transformations",
  treatment =    "G General Review",
}

@Article{Beausoleil:1972:MBM,
  author =       "W. F. Beausoleil and D. T. Brown and B. E. Phelps",
  title =        "Magnetic bubble memory organization",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "587--591",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320E (Storage on stationary magnetic media)",
  corpsource =   "IBM Corp. Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data storage; magnetic bubble memory organization;
                 magnetic domains; magnetic film stores",
  treatment =    "P Practical",
}

@Article{Schuessler:1972:DWS,
  author =       "P. W. H. Schuessler and H. G. Peters and R. M.
                 Poliak",
  title =        "Development of water-soluble systems for use in
                 industrial soldering processes",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "592--597",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170G (General fabrication techniques)",
  corpsource =   "IBM, Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; development; industrial soldering processes;
                 joining processes; soldering; water soluble fluxes;
                 water soluble system",
  treatment =    "G General Review",
}

@Article{Weeks:1972:MTT,
  author =       "W. T. Weeks",
  title =        "Multiconductor transmission-line theory in the {TEM}
                 approximation",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "604--611",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B5240 (Transmission line theory)",
  corpsource =   "IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "capacitance; inductance; Maxwell's equations;
                 multiconductor transmission line; TEM propagation;
                 theory; transmission line theory; uniform perfect
                 dielectric",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dubrulle:1972:SCS,
  author =       "A. A. Dubrulle",
  title =        "Solution of the Complete Symmetric Eigenproblem in a
                 Virtual Memory Environment",
  journal =      j-IBM-JRD,
  volume =       "16",
  number =       "6",
  pages =        "612--616",
  month =        nov,
  year =         "1972",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "405.65013",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290H (Linear algebra); C4140 (Linear algebra); C6120
                 (File organisation); C7310 (Mathematics computing)",
  corpsource =   "IBM Corp., Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "allocation; BASIC software paging; complete symmetric
                 eigenproblem; eigenvalues and eigenfunctions; file
                 organisation; matrices; nla, eig, performance,
                 symmetric matrix; storage; storage management;
                 tridiagonalization; virtual memory environment",
  treatment =    "P Practical",
}

@Article{Kennedy:1973:SSM,
  author =       "D. P. Kennedy and P. C. Murley",
  title =        "Steady state mathematical theory for the insulated
                 gate field effect transistor",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "2--12",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "field effect transistors; insulated gate field effect
                 transistor; mathematical analysis; two dimensional",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chang:1973:CIA,
  author =       "W. Chang",
  title =        "Computer interference analysis",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "13--26",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50 (60K30)",
  MRnumber =     "51 \#4758",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; computer congestion; computer interference
                 analysis; operating systems (computers); queueing
                 theory; queuing time distribution",
  reviewer =     "F. G. Foster",
  treatment =    "T Theoretical or Mathematical",
}

@Article{vanderPool:1973:OSAa,
  author =       "J. A. {van der Pool}",
  title =        "Optimum Storage Allocation for a File in Steady
                 State",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "27--38",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "50 \#9083",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "IBM, Amsterdam, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "file organisation; loading factors; maintenance;
                 optimum storage allocation; storage allocation",
  reviewer =     "Derick Wood",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Price:1973:TPS,
  author =       "P. J. Price",
  title =        "Transport properties of the semiconductor
                 superlattice",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "39--46",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220D (General theory, scattering mechanisms
                 (semiconductors/insulators))",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bloch resonance; carrier mobility; Esaki superlattice;
                 methods; Monte Carlo methods; negative differential
                 mobility; semiconductor superlattice Monte Carlo;
                 semiconductors; transport properties",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hellwarth:1973:DCH,
  author =       "G. A. Hellwarth and S. Boinodiris",
  title =        "Digital-to-analog converter having common-mode
                 isolation and differential output",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "54--60",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1290 (Other analogue circuits); C5180 (A/D and D/A
                 convertors)",
  corpsource =   "IBM, Boca Raton, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; D/A convertors; data acquisition;
                 digital-analogue conversion; IBM system/7 computer;
                 real time automation; real-time; systems",
  treatment =    "A Application",
}

@Article{Rutz:1973:ASM,
  author =       "R. F. Rutz and E. P. Harris and J. J. Cuomo",
  title =        "An {AlN} switchable memory resistor capable of a
                 {20-MHz} cycling rate and 500-picosecond switching
                 time",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "61--5",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560F (Bulk effect devices); C5320G (Semiconductor
                 storage)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "20 MHZ; aluminium compounds; bulk; effect
                 semiconductor devices; metal-insulator-metal devices;
                 MIM devices; multistable resistance; operational
                 characteristics; semiconductor storage devices;
                 semiconductor switches; sputtering; switching devices",
  treatment =    "P Practical",
}

@Article{Chaudhari:1973:AMF,
  author =       "P. Chaudhari and J. J. Cuomo and R. J. Gambino",
  title =        "Amorphous metallic films for bubble domain
                 applications",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "66--8",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7530G (Magnetic anisotropy); A7550 (Studies of
                 specific magnetic materials); A7570K (Domain structure
                 in magnetic films (magnetic bubbles)); B3110C
                 (Ferromagnetic materials)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "amorphous metallic films; bubble domain; cobalt
                 alloys; domains; iron alloys; magnetic; magnetic
                 anisotropy; magnetic thin films; rare earth alloys",
}

@Article{Kelley:1973:AES,
  author =       "R. A. Kelley",
  title =        "{APLGOL}, an experimental structured programming
                 language",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "1",
  pages =        "69--73",
  month =        jan,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APLGOL; computer software; experimental structured
                 programming language; language; procedure oriented
                 languages; programming",
  treatment =    "G General Review",
}

@Article{Lewis:1973:EDM,
  author =       "P. A. W. Lewis and G. S. Shedler",
  title =        "Empirically derived micromodels for sequences of page
                 exceptions",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "86--100",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "Naval Postgraduate School, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer; computer program address; empirically
                 derived micromodels; exceptions; memory hierarchy,
                 Performance Evaluation: Experimental; models for
                 program reference patterns; point process of page
                 exceptions; semi Markov model; sequences of page;
                 statistical analysis; system; traces; virtual storage",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Rissanen:1973:BWB,
  author =       "J. Rissanen",
  title =        "Bounds for weight balanced trees",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "101--105",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05C05 (90B40 94A30)",
  MRnumber =     "48 \#5896",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); C1160
                 (Combinatorial mathematics)",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "entropy; smooth distributions; trees (mathematical);
                 weight balanced binary tree",
  reviewer =     "W.-K. Chen",
  treatment =    "T Theoretical or Mathematical",
}

@Article{vanderPool:1973:OSAb,
  author =       "J. A. {van der Pool}",
  title =        "Optimum storage allocation for a file with open
                 addressing",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "106--114",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "IBM, Amsterdam, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "addressing; cost of retrieval; file organisation; file
                 organizations; key to address transformation; Markov
                 model; open; optimum storage allocation; simulation;
                 simulation method; storage allocation; storage space",
  treatment =    "P Practical",
}

@Article{Stacy:1973:QLE,
  author =       "E. W. Stacy",
  title =        "Quasimaximum likelihood estimators for two-parameter
                 gamma distributions",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "115--124",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240 (Probability and statistics); C1140 (Probability
                 and statistics)",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "covariance formula; density function; elementary;
                 gamma probability distribution; logarithms; new
                 estimators; probability; statistics; variance
                 formulas",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ferris-Prabhu:1973:TMM,
  author =       "A. V. Ferris-Prabhu",
  title =        "Theory of {MNOS} memory device behavior",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "125--134",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices); C5320G
                 (Semiconductor storage)",
  corpsource =   "IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "characteristic; charge transfer; direct tunnelling
                 theory; electron traps; fields; high fields; low;
                 metal-insulator-semiconductor devices; MNOS memory
                 device; oxide thickness; parameters; semiconductor
                 storage devices; switching time; total; trap density;
                 trap distributions; traps; tunnelling; tunnelling
                 probability",
  treatment =    "T Theoretical or Mathematical",
}

@Article{More:1973:ATT,
  author =       "Trenchard {More, Jr.}",
  title =        "Axioms and theorems for a theory of arrays",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "135--175",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "02K99 (68A05)",
  MRnumber =     "49 \#2389",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "282.68011",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C5230
                 (Digital arithmetic methods)",
  corpsource =   "IBM, Philadelphia, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; APL function of reshaping; array theory; arrays;
                 axiomatic theory; Cartesian arrays; Cartesian products;
                 digital arithmetic; empty; operationally transformed
                 functions; outer transforms; positional; programming;
                 programming languages; reduction transforms;
                 replacement operator; separation transforms; set
                 theory; structure of arrays; theory; transfinite
                 arithmetic; transforms; vector spaces; Zermelo Fraenkel
                 set theory",
  reviewer =     "H. B. Curry",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Karnaugh:1973:AEH,
  author =       "M. Karnaugh",
  title =        "Automatic equalizers having minimum adjustment time",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "2",
  pages =        "176--179",
  month =        mar,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6240 (Transmission line links and equipment)",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic equalizers; equalisers; lines; minimum
                 adjustment time; modems; modules; residual distortion;
                 telephone; telephone lines; upper bounds",
  treatment =    "N New Development",
}

@Article{Bohlin:1973:CTM,
  author =       "T. Bohlin",
  title =        "Comparison of two methods of modeling stationary {EEG}
                 signals",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "194--205",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8770E (Patient diagnostic methods and
                 instrumentation); B7510D (Bioelectric signals); C1220
                 (Simulation, modelling and identification); C7330
                 (Biology and medical computing)",
  corpsource =   "IBM Nordic Lab., Lidingo, Sweden",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer aided analysis; electroencephalography;
                 least; maximum likelihood; modelling; power spectra;
                 search method; squares approximations; stochastic
                 processes; total computing effort",
  treatment =    "A Application; X Experimental",
}

@Article{Chow:1973:XIS,
  author =       "C. K. Chow and K. E. Niebuhr and S. K. Hilal",
  title =        "{X}-ray image subtraction by digital means",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "206--218",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8760J (X-rays and particle beams (medical uses));
                 A8770E (Patient diagnostic methods and
                 instrumentation); B7510B (Radiation and radioactivity
                 applications in biomedicine); C7330 (Biology and
                 medical computing)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer aided analysis; digital processing; medical
                 radiography; nonlinear; operations; patient diagnosis;
                 picture; processing; radiography; X-ray applications;
                 X-ray image subtraction",
  treatment =    "A Application; P Practical",
}

@Article{Dodge:1973:APM,
  author =       "F. A. {Dodge, Jr.} and J. W. Cooley",
  title =        "Action potential of the motorneuron",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "219--229",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8728 (Bioelectricity); A8730C (Electrical activity in
                 neurophysiological processes); A8730 (Biophysics of
                 neurophysiological processes); C1290L (Systems theory
                 applications in biology and medicine)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "action potential; bioelectric potentials; differential
                 equation; Hodgkin Huxley model; modelling; motorneuron;
                 nerve fibre partial; neural nets; neurophysiology;
                 physiological models",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Friedman:1973:IUP,
  author =       "H. P. Friedman and J. H. Siegel and R. M. Goldwyn and
                 E. J. Farrell and M. Miller",
  title =        "Identifying and understanding patterns and processes
                 in human shock and trauma",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "230--240",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8770E (Patient diagnostic methods and
                 instrumentation); B7510 (Biomedical measurement and
                 imaging); C7330 (Biology and medical computing)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "biomedical measurement; information analysis;
                 information base; information processing; medical;
                 multivariable analysis; patient diagnosis; physiologic
                 measurements",
  treatment =    "G General Review",
}

@Article{Patrin:1973:PVH,
  author =       "N. A. Patrin",
  title =        "Performance of very high density charge coupled
                 devices",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "241--248",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1260 (Pulse circuits); B1265 (Digital electronics);
                 B2560S (Other field effect devices); B2570
                 (Semiconductor integrated circuits); C5120 (Logic and
                 switching circuits)",
  corpsource =   "IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "charge-coupled devices; dependency; digital integrated
                 circuits; fat zero operation; frequency response;
                 monolithic integrated circuits; performance; registers;
                 shift; temperature; transfer efficiency; very high
                 density charge coupled devices",
  treatment =    "X Experimental",
}

@Article{Ho:1973:TCA,
  author =       "C. W. Ho",
  title =        "Theory and computer-aided analysis of lossless
                 transmission lines",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "249--255",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1150F (Distributed linear networks); B5240
                 (Transmission line theory); C7410D (Electronic
                 engineering computing)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "aided analysis; computer; computer-aided circuit
                 analysis; conductance matrix; distributed parameter;
                 lossless transmission lines; networks; time-domain
                 analysis; transmission line theory",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Warnecke:1973:RID,
  author =       "A. J. Warnecke and P. J. LoPresti",
  title =        "Refractive index dispersion in semiconductor-related
                 thin films",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "256--262",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7820D (Optical constants and parameters); A7865
                 (Optical properties of thin films); A8115 (Methods of
                 thin film deposition); B0520 (Thin film growth); B2550
                 (Semiconductor device technology)",
  corpsource =   "IBM, East Fishkill, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "insulating thin films; LASER-VAMFO interferometer;
                 photoresists; refractive index; refractive index
                 dispersion; related thin films; semiconductor;
                 semiconductor device manufacture",
  treatment =    "X Experimental",
}

@Article{Chamberlin:1973:ESD,
  author =       "D. D. Chamberlin and H. P. Schlaeppi and I.
                 Wladawsky",
  title =        "Experimental study of deadline scheduling for
                 interactive systems",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "263--269",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "allocation strategy; deadline scheduling; interactive
                 systems; operating systems (computers); paging;
                 resource; scheduling; time slicing strategies; virtual
                 storage",
  treatment =    "X Experimental",
}

@Article{Lew:1973:AES,
  author =       "J. S. Lew",
  title =        "Asymptotic expansion for small magnetic fields of
                 acoustoelectric attenuation in nondegenerate
                 semiconductors",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "3",
  pages =        "270--272",
  month =        may,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7250 (Acoustoelectric effects (electronic
                 transport))",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acoustoelectric; acoustoelectric effects; asymptotic
                 expansion; attenuation; magnetic field effects;
                 nondegenerate semiconductors; semiconductors; small
                 magnetic fields",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shimizu:1973:NCS,
  author =       "F. Shimizu",
  title =        "Numerical calculation of self-focusing and trapping of
                 a short light pulse in {Kerr} liquids",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "286--298",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4265J (Beam trapping, self focusing, thermal
                 blooming, and related effects); B4340 (Nonlinear optics
                 and devices)",
  corpsource =   "Univ. Tokyo, Bunkyo-Ku, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cutoff radius; dispersion; filament; finite relaxation
                 time; Kerr; limiting radius; liquids; multimode lasers;
                 numerical analysis; numerical calculation; parabolic
                 scalar wave equation; quadratic nonlinear; refractive
                 index; scattering; self-focusing; short light pulse;
                 stimulated Raman; trapping; wave equations",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Peng:1973:EDS,
  author =       "S. T. Peng and R. Landauer",
  title =        "Effects of dispersion on steady state electromagnetic
                 shock profiles",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "299--306",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4110H (Electromagnetic waves: theory); B5210
                 (Electromagnetic wave propagation)",
  corpsource =   "Polytech. Inst. Brooklyn, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "dispersion (wave); dispersion requirements;
                 electromagnetic shock profiles; electromagnetic waves;
                 models; nonlinear electromagnetic media; nonlinear
                 transmission line; shock waves; steady state",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Canosa:1973:NDE,
  author =       "Jos{\'e} Canosa",
  title =        "On a nonlinear diffusion equation describing
                 population growth",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "307--313",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "35Q99 (92A10)",
  MRnumber =     "48 \#4537",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290K (Nonlinear and functional equations); C4150
                 (Nonlinear and functional equations)",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "advance of advantageous genes; diffusion; equation;
                 Fisher's nonlinear diffusion; nonlinear eigenvalue
                 problem; nonlinear equations; phase plane analysis;
                 phase space methods; population growth; shock;
                 shocklike travelling waves; wave equations; waves",
  reviewer =     "G. L. Lamb, Jr.",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gerber:1973:LCP,
  author =       "P. D. Gerber",
  title =        "Linearization of {Cauchy}'s problem for quadratic
                 semilinear partial differential equations",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "314--323",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "35Q99",
  MRnumber =     "48 \#4538",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "276.35021",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290P (Differential equations); C1310 (Control system
                 analysis and synthesis methods); C1340J (Distributed
                 parameter control systems); C4170 (Differential
                 equations)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Cauchy's problem; disjoint subsystems; hyperbolic
                 systems; linear algebra; linearisation techniques;
                 linearization; partial differential equations;
                 quadratic semilinear",
  reviewer =     "G. L. Lamb, Jr.",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Falkoff:1973:DA,
  author =       "A. D. Falkoff and K. E. Iverson",
  title =        "The design of {APL}",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "324--334",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  corpsource =   "IBM, Philadelphia, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; design process; practicality; principle of;
                 principle of simplicity; procedure oriented languages;
                 system management",
  treatment =    "G General Review",
}

@Article{Ghandour:1973:GAO,
  author =       "Z. Ghandour and J. Mezei",
  title =        "General arrays, operators and functions",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "335--352",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "IBM, Philadelphia, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "file organisation; functions; general arrays;
                 operators; procedure oriented languages",
  treatment =    "G General Review",
}

@Article{Lathwell:1973:SFA,
  author =       "R. H. Lathwell",
  title =        "System formulation and {APL} shared variables",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "4",
  pages =        "353--359",
  month =        jul,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6150C
                 (Compilers, interpreters and other processors)",
  corpsource =   "IBM, Philadelphia, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; APL shared variable system; collections of
                 autonomous processors; communication with APL programs;
                 interfaces consisting; of shared variables; procedure
                 oriented languages; program processors; system
                 formulation; systems",
  treatment =    "G General Review",
}

@Article{Delobel:1973:DDB,
  author =       "C. Delobel and R. G. Casey",
  title =        "Decomposition of a Data Base and the Theory of
                 {Boolean} Switching Functions",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "374--386",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "48 \#10233",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See \cite{Delobel:1977:CDD}.",
  abstract =     "The notion of a fundamental relation among the
                 attributes of a data set can be fruitfully applied in
                 the structuring of an information system. These
                 relations are meaningful both to the user of the system
                 in his semantic understanding of the data, and to the
                 designer in implementing the system. An important
                 equivalence between operations with functional
                 relations and operations with analogous Boolean
                 functions is demonstrated in this paper. The
                 equivalence is computationally helpful in exploring the
                 properties of a given set of functional relations, as
                 well as in the task of partitioning a data set into
                 subfiles for efficient implementation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C4230 (Switching theory); C6120
                 (File organisation)",
  classification = "723; 901",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Boolean functions; Boolean switching functions;
                 computer metatheory --- Boolean Functions; data base
                 decomposition; file organisation; information retrieval
                 systems; switching functions",
  reviewer =     "J. C. Muzio",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bard:1973:CPP,
  author =       "Y. Bard",
  title =        "Characterization of Program Paging in a Time-Sharing
                 Environment",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "387--393",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a method for predicting the
                 paging behavior of a program in a virtual memory
                 multiprogramming environment. The effect of overall
                 system activity on the program is summarized in one
                 parameter, the page survival index. The model
                 correlates well with observations taken on programs
                 running under CP-67. The model can be used for paging
                 load prediction, simulator input verification, and
                 evaluation of program rearrangement and sharing.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "722; 723",
  corpsource =   "IBM, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; computer systems,
                 digital --- Time Sharing; control program 67; file
                 organisation; load prediction; page; program paging;
                 simulator input; survival index; time sharing
                 environment; time-sharing systems; verification;
                 virtual memory multiprogramming; virtual storage",
  treatment =    "G General Review; X Experimental",
}

@Article{Silverman:1973:RTC,
  author =       "H. F. Silverman and P. C. Yue",
  title =        "Response Time Characterization of an Information
                 Retrieval System",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "394--403",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A methodology for computer performance evaluation
                 based on the statistical characterization of response
                 time is described. The results of its application to an
                 information retrieval system are presented. The first
                 part of the paper gives a general discussion of
                 measurement techniques, data reduction procedures and
                 the structure of the system being examined. A set of
                 ``system environment'' parameters and a set of ``job''
                 parameters are then defined and appraised in terms of
                 actual measurements collected over two different weekly
                 periods. Various ways of using the statistical
                 characterization for improving performance are then
                 considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "C0310 (EDP management); C6150G (Diagnostic, testing,
                 debugging and evaluating systems); C7250 (Information
                 storage and retrieval)",
  classification = "722; 723; 901",
  corpsource =   "IBM T. J. Watson Res. Centre, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer performance; computer selection and
                 evaluation; computer systems, digital ---
                 Multiprocessing; data acquisition; evaluation;
                 information retrieval system; information retrieval
                 systems; response time characterisation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chamberlin:1973:APA,
  author =       "D. D. Chamberlin and S. H. Fuller and L. Y. Liu",
  title =        "Analysis of Page Allocation Strategies for
                 Multiprogramming Systems with Virtual Memory",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "404--412",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a multiprogramming, virtual-memory computing
                 system, many processes compete for the main storage
                 page frames and CPU's of the real system. It is
                 customary to define a subset of these processes called
                 the ``multiprogramming set'' (MPS), and to allocate
                 resources only to those processes currently in the MPS.
                 Each process remains in the MPS for a limited time and
                 is then demoted. The system paging manager controls the
                 size of the MPS; it allocates the available page frames
                 among the processes in the MPS and fetches appropriate
                 pages into the page frames. A model is described that
                 assumes the most critical resources of the system to be
                 page frames and the paging channel (i.e., there is no
                 significant CPU contention). The model makes certain
                 assumptions about the page fault rate of processes as a
                 function of page frames allocated, and about the page
                 fetch time as a function of mean load on the paging
                 channel. The model also incorporates a definition of
                 the value of a given page allocation in terms of system
                 throughput. The model is used to study various
                 strategies for choosing an MPS and allocating page
                 frames among processes. For simple cases, the model
                 yields an exact optimal strategy. A heuristic strategy
                 is proposed for dealing with more complex cases, and is
                 shown by the model to be reasonably near optimal. The
                 heuristic strategy monitors the page fault rate of each
                 process and chooses an allocation such that each
                 process can be executed at a reasonable rate, while
                 ensuring that the paging channel is neither overloaded
                 nor underloaded.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "722",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; multiprogramming;
                 multiprogramming systems; page allocation strategies;
                 virtual memory; virtual storage",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kobayashi:1973:DRC,
  author =       "H. Kobayashi and D. T. Tang",
  title =        "Decision-Feedback Receiver for Channels with Strong
                 Intersymbol Interference",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "413--419",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with the problem of equalizing
                 channels containing strong intersymbol interference.
                 Typical of such channels are those of digital magnetic
                 recording systems and data communication systems with
                 partial-response signaling. First the authors discuss
                 reasons that a conventional receiver with a linear
                 equalizer cannot efficiently compensate for distortion
                 in such channels. They then present a new receiver
                 configuration in which the equalizer and quantizer are
                 embedded in an inverse filter circuit that eliminates
                 major intersymbol interference components. This
                 configuration allows them to use a simple iteration
                 algorithm to adaptively adjust the equalizer.
                 Application of the scheme to digital magnetic recording
                 data is discussed as an illustrative example.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); B6240
                 (Transmission line links and equipment); C1260
                 (Information theory)",
  classification = "716",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data communication systems; data transmission;
                 decision; digital communication systems; digital
                 magnetic recording; distortion; equalisers; feedback
                 receiver; interference; intersymbol interference;
                 linear equaliser; magnetic recording; quantiser;
                 receivers; systems",
  treatment =    "N New Development; P Practical",
}

@Article{Donath:1973:LBP,
  author =       "W. E. Donath and A. J. Hoffman",
  title =        "Lower Bounds for the Partitioning of Graphs",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "420--425",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05C99",
  MRnumber =     "48 \#8304",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Graphs were generated by connecting a preset number of
                 vertices with some probability p, and removing
                 unconnected vertices from the graph. Results are given
                 for graphs having 20, 40, 60, and 100 nodes; the ratio
                 $B_U/B_L$ is computed for each graph and averaged over
                 all graphs of each of the various sets of equal size.
                 It can be seen that this ratio which is about 1.6 for
                 many of the cases, gives a reasonable range. Pertinent
                 to the problem of computer logic partitioning.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); C1160
                 (Combinatorial mathematics); C4290 (Other computer
                 theory)",
  classification = "722",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "classification; computation theory; computer logic;
                 computer programs; computer systems, digital; graph
                 theory; graphs partitioning; lower bounds; nodes;
                 paging; partitioning",
  reviewer =     "Moshe Rosenfeld",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Matthews:1973:DGG,
  author =       "J. W. Matthews and E. Klokholm and T. S. Plaskett",
  title =        "Dislocations in gadolinium gallium garnet
                 ({Gd$_3$Ga$_5$O$_{12}$}). {III}. Nature of prismatic
                 loops and helical dislocations",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "426--429",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Thin garnet films suitable for magnetic bubble devices
                 can be made by depositing the film material onto
                 nonmagnetic garnets such as {Gd$_3$Ga$_5$O$_1$}$_2$
                 (GGG). The performance of these devices is influenced
                 by the dislocation content of the films. This, in turn,
                 depends on the dislocation content of the substrate.
                 Dislocations in the substrate can be detected by means
                 of the birefrigence they induce, or from the etch pits
                 formed where they meet the sample surface. Most of the
                 dislocations revealed by these techniques have been
                 climb loops around inclusions and helical dislocations.
                 This paper describes an optical method for determining
                 the sign of the stresses at inclusions and nature of
                 loops and helical dislocations. The method has shown
                 that iridium inclusions are compressed by the matrix
                 and that the loops and helices in GGG are extrinsic;
                 they grow either by the emission of vacancies or the
                 absorption of interstitial atoms.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170 (Defects in crystals); B3120L (Magnetic bubble
                 domain devices); B3120N (Magnetic thin film devices);
                 B3120 (Magnetic material applications and devices)",
  classification = "708; 933",
  corpsource =   "IBM Thomas J. Watson, Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "birefringence; crystals --- Defects; dislocations;
                 film devices; gadolinium compounds; gadolinium gallium
                 garnet; garnets; helical; magnetic bubble devices;
                 magnetic materials; magnetic thin; prismatic loops;
                 substrates",
  treatment =    "X Experimental",
}

@Article{Critchlow:1973:DCN,
  author =       "D. L. Critchlow and R. H. Dennard and S. E. Schuster",
  title =        "Design and characteristics of $n$-channel
                 insulated-gate field-effect transistors",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "430--442",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An n-channel insulated-gate field-effect transistor
                 technology established at IBM Research has served as
                 the basis for further development leading to FET
                 memory. Designs and characteristics of experimental
                 devices of 500 and 1000 A gate insulator thicknesses
                 are presented, with particular attention to the effects
                 of source-drain spacing.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices); C5320G
                 (Semiconductor storage)",
  classification = "714",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "characteristics; design; field effect transistors;
                 IGFET; memory; n-channel; semiconductor; semiconductor
                 storage devices; surface drain spacing; transistors,
                 field effect",
  treatment =    "P Practical",
}

@Article{Magdo:1973:TOS,
  author =       "S. Magdo",
  title =        "Theory and Operation of Space-Charge-Limited
                 Transistors with Transverse Injection",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "5",
  pages =        "443--458",
  month =        sep,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The development of a new device, called the
                 space-charge-limited (SCL) transistor with transverse
                 injection is reported in this paper. A theoretical
                 model for space-charge-limited transistors, both npn
                 and pnp, on high-resistivity silicon substrates, is
                 described and a quantitative analysis is given.
                 Experimental results for SCL transistors are presented
                 to support the model's validity. According to the
                 model, current in SCL transistors is controlled by the
                 base of a parallel-connected lateral transistor in two
                 ways. First, the base of the parallel transistor
                 controls the potential step in the high resistivity
                 base of the SCL transistor. Second, the base of the
                 parallel transistor injects carriers in the direction
                 transverse to the SCL current flow. These carriers are
                 of types opposite to those that carry the current flow
                 in the SCL transistor and thus partly neutralize the
                 space-charge in the current flow. The carriers
                 propagate, predominantly by drift, across the
                 high-resistivity base region of the SCL transistor. The
                 resulting base transit time is about two orders of
                 magnitude faster than that of a bipolar transistor with
                 equal base width. No charge storage takes place in
                 saturation. These features and the very low device
                 capacitances make the SCL transistor attractive for
                 low-power, fast-switching applications. Current gains
                 as high as 70,000 are obtained at low current levels.
                 The current gain decreases at higher current levels
                 because the parallel lateral transistor turns on. It is
                 also demonstrated that complementary pairs of SCL
                 transistors can be fabricated with three masking steps,
                 including metalization.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors)",
  classification = "714",
  corpsource =   "IBM, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar transistors; charge; fast switching
                 applications; metallisation; operation; semiconductor
                 device models; space; space charge limited;
                 space-charge-limited transistors; transistors;
                 transverse injection",
  treatment =    "N New Development; P Practical; X Experimental",
}

@Article{Hauge:1973:DOE,
  author =       "P. S. Hauge and F. H. Dill",
  title =        "Design and operation of {ETA}, an automated
                 ellipsometer (f.e.t. gate insulator thickness
                 measurement)",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "472--489",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design and operational features are described for
                 a computer-assisted ellipsometer (called ETA for
                 Ellipsometric Thickness Analyzer), developed to provide
                 reliable, real-time measurement of field-effect
                 transistor gate insulator thickness in a manufacturing
                 environment. ETA illuminates the sample with light of
                 fixed polarization and uses a rotating analyzer to
                 measure the polarization of the reflected light. Sample
                 alignment is done automatically by ETA, so that usually
                 no operator adjustments are required. Fourier analysis
                 of the light transmitted by the analyzer is used to
                 reduce noise and enhance measurement precision. In its
                 normal mode of operation ETA can measure single and
                 double-layer films of SiO$_2$ and Si$_3$N$_4$ in the
                 thickness range of 300 to 800 A with precision
                 comparable to that of conventional ellipsometers. Other
                 modes of operation, which make use of a fixed-position
                 compensator in the incident light path, allow precise
                 measurement of thin films (0 to 300 A) and permit use
                 of ETA as a general-purpose ellipsometer. The typical
                 time interval required for wafer alignment, data
                 acquisition, analysis and recorded output of film
                 thickness is about five seconds, and the measurement
                 reproducibility is typically about 1 A.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650 (Data handling and computation); A0670E (Testing
                 equipment); A0670T (Servo and control devices); A0760F
                 (Optical polarimetry and ellipsometry); B2560S (Other
                 field effect devices); C3380D (Control of physical
                 instruments); C7410D (Electronic engineering
                 computing)",
  classification = "714; 941",
  corpsource =   "IBM, New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automated ellipsometer; automatic test
                 equipment; computer aided analysis; computer assisted
                 ellipsometer; control; data reduction and; electronics
                 applications of computers; ellipsometers; ellipsometry;
                 engineering applications of computers; FET; field
                 effect transistors; films; gate insulator thickness
                 measurement; optical instruments; polarimeters;
                 semiconductor device manufacture; thickness
                 measurement",
  treatment =    "A Application; P Practical",
}

@Article{Kallmeyer:1973:RPC,
  author =       "M. Kallmeyer and K. Kosanke and F. Schedewie and B.
                 Solf and D. Wagner",
  title =        "Rapid, Precise, Computer-Controlled Measurement of
                 {X-Y} Coordinates",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "490--499",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An experimental x-y measurement system is described
                 that was designed for the high-speed, high-precision
                 measurements required in integrated circuit
                 manufacturing and for optical measurement applications
                 in which a sufficiently large data base is required for
                 statistical process analysis. The technology for this
                 experimental system differs considerably from that of
                 conventional optical measuring systems in current use
                 and utilizes a computer for data acquisition,
                 manipulation and evaluation. The system, utilizing the
                 edge detection principle, presently operates at a
                 measuring speed of 2.5 cm/s. An analysis gives both the
                 short-term and the long-term precision of the system.
                 The standard deviation for the short-term precision is
                 0.038 $\mu$ m.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A0650 (Data
                 handling and computation); A0670T (Servo and control
                 devices); A0760P (Optical microscopy); B2220
                 (Integrated circuits); B2570 (Semiconductor integrated
                 circuits); C3380D (Control of physical instruments);
                 C7410D (Electronic engineering computing)",
  classification = "713",
  corpsource =   "IBM Deutschland GmBH, Sindelfingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "applications; automatic control; computer; computers;
                 control engineering applications of; controlled
                 measurement; data acquisition; data reduction and
                 analysis; electronics applications of computers;
                 integrated circuit; integrated circuit manufacture;
                 integrated circuit manufacturing; microscopy; optical
                 measurement; position measurement; production;
                 statistical process analysis; XY coordinate
                 measurement",
  treatment =    "A Application; P Practical",
}

@Article{Schechtman:1973:IUT,
  author =       "B. H. Schechtman and S. S. So and E. W. Luttman",
  title =        "Interactive Use of a Time-Shared Process Control
                 Computer in Electrophotographic Sensitometry",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "500--508",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The usefulness of electrophotographic exposure
                 sensitometry as means of characterizing and evaluating
                 new photoconductor materials has been extended by
                 coupling the experiment to an on-line computer. This
                 automated system provides several new functional
                 capabilities not realistically attainable in manual
                 operation and drastically reduces the time lag in the
                 exchange of information between research workers who
                 prepare materials and those who evaluate the materials.
                 These various improvements have been achieved by
                 extensive use of interactive graphic techniques and a
                 user-oriented data-base organization.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650 (Data handling and computation); A0670T (Servo
                 and control devices); A0768 (Photography, photographic
                 instruments and techniques); C3370N (Control
                 applications in photography and cinematography); C3380D
                 (Control of physical instruments); C7490 (Computing in
                 other engineering fields)",
  classification = "731; 732; 742; 745",
  corpsource =   "San Jose Res. Lab., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automated system; automatic control; data
                 acquisition; data reduction and; electrophotographic
                 sensitometry; electrophotography; interactive use;
                 photographic material; photographic reproduction ---
                 Electrostatic; process control; sensitivity; shared
                 process control computer; time",
  treatment =    "A Application; P Practical",
}

@Article{Flamholz:1973:DMD,
  author =       "A. L. Flamholz and H. A. Froot",
  title =        "Dimensional Measurement and Defect Detection Using
                 Spatial Filtering",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "509--518",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new method is described that utilizes coherent
                 bandpass spatial filtering and subsequent superposition
                 to form filtered images in which small differences in
                 size and geometry of the original object are readily
                 detected. The theoretical basis is discussed and
                 experiments described in which signal ratios of about
                 10:1 are obtained for a diameter change of 2.5 percent
                 of a clear circular disk. The method is used to process
                 in parallel a 57-mm evaporation mask containing 12,000
                 holes, each being 0.1 mm in diameter. The size of each
                 hole is accurately gaged and small imperfections are
                 indicated in the filtered image.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4280C (Spectral and other filters); B2220 (Integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "723; 741",
  corpsource =   "IBM, East Fishkill, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data processing; defect detection; dimensional
                 measurement; evaporation masks; fault location;
                 filtering; information processing; masks; micrometry;
                 optical; optical data processing; optical filters;
                 optics; spatial",
  treatment =    "A Application; P Practical",
}

@Article{Chastang:1973:OTM,
  author =       "J. C. Chastang",
  title =        "Optical Techniques for Measurement of Chamber
                 Spacing",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "519--524",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Two optical methods were investigated for accurately
                 measuring the gap, or chamber spacing, that separates
                 two closely spaced transparent plates. The first method
                 uses a special microscope in which the main feature is
                 a unit-magnification catadioptric system that gives an
                 aberration-free image of the chamber outside the
                 plates, where it is accessible to a high-power
                 objective. The second method is based upon the light
                 section principle, whereby the image of a slit is
                 projected onto the boundaries of the chamber and is
                 thus doubled. The reflected images are observed with a
                 microscope and the degree of separation, which is
                 proportional to the chamber spacing, is measured.
                 Accuracy better than 2 $\mu$ m is obtained for the two
                 techniques. The choice of the appropriate method
                 depends on the surface quality of the chamber
                 boundaries.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0760P (Optical microscopy)",
  classification = "741; 943",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chamber spacing measurement; closely spaced
                 transparent plates; distance measurement; mechanical
                 variables measurement --- Distance; microscopy; optical
                 techniques; optics",
  treatment =    "P Practical",
}

@Article{Bennett:1973:LRC,
  author =       "C. H. Bennett",
  title =        "Logical Reversibility of Computation",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "525--532",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A25",
  MRnumber =     "56 \#7325",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "267.68024",
  abstract =     "The usual general-purpose computing automation (e.g.,
                 a Turing machine) is logically irreversible --- its
                 function lacks a single-valued inverse. Here it is
                 shown that such machines may be made logically
                 reversible at every step, while retaining their
                 simplicity and their ability to do general
                 computations. This result is of great physical interest
                 because it makes plausible the existence of
                 thermodynamically reversible computers which could
                 perform useful computations at useful speed while
                 dissipating considerably less than kT of energy per
                 logical step. In the first stage of its computation the
                 logically reversible automaton parallels the
                 corresponding irreversible automaton, except that it
                 saves all intermediate results, thereby avoiding the
                 irreversible operation of erasure. The second stage
                 consists of printing out the desired output. The third
                 stage then reversibly disposes of all the undesired
                 intermediate results by retracing the steps of the
                 first stage in backward order (a process which is only
                 possible because the first stage has been carried out
                 reversibly), thereby restoring the machine (except for
                 the now-written output tape) to its original condition.
                 The final machine configuration thus contains the
                 desired output and a reconstructed copy of the input,
                 but no other undesired data. The foregoing results are
                 demonstrated explicitly using a type of three-tape
                 Turing machine. The biosynthesis of messenger RNA is
                 discussed as a physical example of reversible
                 computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4220 (Automata theory)",
  classification = "723",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automata theory; computation; computer metatheory;
                 computing automaton; logical reversibility; Turing
                 machine",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Anderson:1973:APP,
  author =       "H. A. {Anderson, Jr.}",
  title =        "Approximating Pre-Emptive Priority Dispatching in a
                 Multiprogramming Model",
  journal =      j-IBM-JRD,
  volume =       "17",
  number =       "6",
  pages =        "533--539",
  month =        nov,
  year =         "1973",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The formulation of the closed queueing network model
                 of a multiprogramming computer system is generalized to
                 allow each task to have its own set of facility service
                 rates and I/O device selection probability
                 distribution. In the model, processor sharing is
                 assumed for different types of customers. It is shown
                 through a series of investigations that the model
                 reasonably approximates pre-emptive priority
                 dispatching.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "723; 922",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(computers); closed queuing network model; computer
                 systems programming; dispatching; dispatching
                 approximation; multiprogramming; multiprogramming
                 computer system; multiprogramming model; operating
                 systems; preemptive priority; probability --- Queueing
                 Theory; queueing theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Belady:1974:OMP,
  author =       "L. A. Belady and F. P. Palermo",
  title =        "On-line measurement of paging behavior by the
                 multivalued {MIN} algorithm",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "2--19",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "50 \#6234",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An algorithm is presented that extracts the sequence
                 of minimum memory capacities (MMCs) from the sequence
                 of page references generated by a program as it is
                 executed in a demand paging environment. The new
                 algorithm combines the advantages of existing
                 approaches in that the MMC's are produced in a single
                 pass, as is the output of the MIN algorithm for a
                 single memory size, and the MMC sequence is identical
                 to the optimum stack distances provided by the OPT
                 algorithm, which requires two passes. A hardware
                 implementation is outlined as an extension to existing
                 page management mechanisms. The resulting device could
                 be used to produce continuously the MMC information,
                 while the (paging) machine executes the program at
                 essentially full speed. The paper also discusses the
                 possible impact of the algorithm on the study of
                 program behavior and on the development of space
                 sharing (paging) algorithms. Finally, a proof is
                 provided that the algorithm in fact produces an output
                 identical to that of OPT.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "capacities; computer programming; demand paging;
                 hardware; multiprogramming; multivalued MIN algorithm;
                 online measurement; optimum stack distances; page
                 management; sequence of minimum memory; sequence of
                 page references; sharing; space; storage management;
                 virtual storage",
  reviewer =     "Richard A. DeMillo",
  treatment =    "P Practical",
}

@Article{Beatty:1974:RAA,
  author =       "J. C. Beatty",
  title =        "Register Assignment Algorithm for Generation of Highly
                 Optimized Object Code",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "20--39",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "50 \#6201",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A register assignment algorithm is described that, in
                 contrast to traditional methods, permits a high level
                 of optimization both local and global levels. This
                 involves splitting local register optimization into two
                 phases, with global assignment intervening. Because
                 novel techniques are used in the global assignment
                 procedure, it is described in detail. Experimental
                 results with a prototype implementation are presented
                 in which object code improvements on the order of 25
                 percent over a production optimizing compiler were
                 obtained. No attempt was made to assess manpower costs
                 of a final implementation nor to weight them against
                 expected improvements in generated code.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130 (Data handling techniques); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compiler; computer programming; global assignment;
                 local register optimization; object code improvements;
                 optimisation; program compilers; register assignment
                 algorithm; storage allocation",
  reviewer =     "W. D. Maurer",
  treatment =    "P Practical",
}

@Article{Lever:1974:WVO,
  author =       "R. F. Lever and H. M. Demsky",
  title =        "Water Vapor as an Oxidant in {BBr}$_3$ Open-Tube
                 Silicon Diffusion Systems",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "40--46",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of water vapor as an oxidant in place of
                 oxygen enables a wide range of surface concentrations
                 to be obtained in a single-step process. The
                 concentration of boron at the silicon surface is found
                 to be constant throughout the diffusion process
                 because, at the temperature used, the oxide growth is
                 not parabolic.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0510 (Crystal growth); B2550 (Semiconductor device
                 technology)",
  classification = "712; 714",
  corpsource =   "IBM, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "BBr/sub 3/; boron; concentrations; elemental
                 semiconductors; open; oxide growth; range of surface;
                 semiconducting silicon --- Doping; semiconductor device
                 manufacture; semiconductor doping; silicon; silicon
                 diffusion systems; tube diffusion systems; water vapour
                 oxidant",
  treatment =    "A Application",
}

@Article{Chang:1974:PDI,
  author =       "W. H. Chang and H. S. Lee",
  title =        "Potential Distribution of an Inhomogeneously Doped
                 {MIS} Array",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "47--52",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A numerical method is used to obtain the potential
                 distribution of a two-dimensional, inhomogeneously
                 doped MIS array under pulse voltage operation. The
                 effects of interface charge and of impurity doping and
                 its locations on the surface potential profile are
                 presented. The technique is useful for designing an
                 appropriate surface potential profile for ion-implanted
                 charge-coupled devices.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7320H (Surface impurity and defect levels; energy
                 levels of adsorbed species); B2550B (Semiconductor
                 doping); B2560S (Other field effect devices)",
  classification = "714",
  corpsource =   "IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "charge coupled devices; charge-coupled devices;
                 devices; distribution; impurity doping; inhomogeneously
                 doped MIS array; interface charge; ion implanted;
                 metal-insulator-semiconductor; numerical method;
                 potential; pulse voltage operation; semiconductor
                 devices, mis; semiconductor doping; surface potential;
                 surface potential profile",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Beisner:1974:NCN,
  author =       "H. M. Beisner",
  title =        "Numerical Calculation of Normal Modes for Underwater
                 Sound Propagation",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "53--58",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Hartree's method for calculation of atomic wave
                 functions is applied to the Schroedinger-like normal
                 mode equation for underwater sound propagation. Rapid
                 convergence was obtained for the twelve normal modes at
                 five Hertz with a typical velocity profile. The normal
                 modes are given, along with an example of the pressure
                 field, and a means for numerical calculation of the
                 near field modes is suggested.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4330 (Underwater sound)",
  classification = "751",
  corpsource =   "IBM, Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "5 Hz; acoustic wave propagation; acoustic waves ---
                 Transmission; acoustics, underwater; convergence;
                 convergence of numerical methods; Hartree's method;
                 Hartree--Fock method; near field modes; normal mode
                 equation; pressure field; propagation; Schr{\"o}dinger
                 equation; underwater sound",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pistor:1974:SCR,
  author =       "P. Pistor",
  title =        "Stability Criterion for Recursive Filters",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "59--71",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A05",
  MRnumber =     "50 \#4097",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new criterion is derived that relates the stability
                 of two-dimensional recursive filters to the properties
                 of its cepstrum. It provides a procedure for the
                 decomposition of unstable recursive filters having
                 nonzero, nonimaginary frequency response into stable
                 recursive filters. The optimal solution of the
                 decomposition problem is discussed, including numerical
                 implementation and nonrecursive solutions. Several
                 numerical examples show the potentialities and
                 limitations of the rules for decomposition and for
                 truncation of the operators.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1270 (Filters and other networks); B6140 (Signal
                 processing and detection); C1260 (Information theory)",
  classification = "716; 718; 731",
  corpsource =   "IBM, Heidelberg, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cepstrum; decomposition problem; digital filters;
                 filtering and prediction theory; frequency; information
                 theory; nonrecursive solutions; numerical
                 implementation; response; stability criteria; stability
                 criterion; truncation; two dimensional recursive
                 filters",
  reviewer =     "P. R. Bryant",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Agizy:1974:EOS,
  author =       "M. N. Agizy",
  title =        "Economic order and surplus quantities model",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "72--5",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290D (Systems theory applications in economics and
                 business); C1290F (Systems theory applications in
                 industry); C7160 (Manufacturing and industrial
                 administration)",
  corpsource =   "Exxon Corp., Florham Park, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "carrying; charges; demand; economic cybernetics;
                 economic order and surplus; economic order quantity
                 model; interest charges; inventory management;
                 modelling; ordering cost; quantities model; standard
                 mathematical model; stock control",
  treatment =    "E Economic; T Theoretical or Mathematical",
}

@Article{ElAgizy:1974:EOS,
  author =       "M. N. {El Agizy}",
  title =        "Economic Order and Surplus Quantities Model",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "72--75",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A standard mathematical model for inventory management
                 is known as the Economic Order Quantity (EOQ) model.
                 Now, the EOQ model is extended to include the
                 possibility of determining how much, if any, excess
                 stock should be sold at the beginning of a decision
                 period. The new model is of practical importance for
                 situations in which a formal inventory management
                 system is to be instituted while substantial
                 inventories exist or when changes in demand, ordering
                 cost, or carrying and interest charges require
                 recomputation of the economic order quantity.",
  acknowledgement = ack-nhfb,
  classification = "911",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "inventory control",
}

@Article{Das:1974:PLE,
  author =       "G. Das and N. A. O'Neil",
  title =        "Preparation of Large-Area Electron-Transparent Samples
                 from Silicon Devices",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "1",
  pages =        "76--79",
  month =        jan,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A technique using a pulsating chemical jet has been
                 developed for thinning and polishing large areas (750
                 to 1000 $\mu$ m in diameter) of silicon devices. The
                 thickness can be reduced to a few micrometers. This
                 technique has been used to prepare bipolar and FET
                 samples for transmission electron microscopy. Physical
                 characterization of more than twenty devices can be
                 achieved by one sample preparation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0660E (Sample preparation); A0670E (Testing
                 equipment); A0780 (Electron and ion microscopes and
                 techniques); B0510 (Crystal growth); B2390 (Electron
                 and ion microscopes); B2550E (Surface treatment for
                 semiconductor devices); B2550 (Semiconductor device
                 technology); B2560 (Semiconductor devices)",
  classification = "422; 423; 714",
  corpsource =   "IBM, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar samples; devices; electron microscopy;
                 electron transparent samples; FET samples; large area;
                 polishing; preparation; pulsating chemical jet; sample;
                 semiconductor device; semiconductor devices; silicon;
                 specimen preparation; testing; thinning; transmission
                 electron microscopy",
  treatment =    "P Practical",
}

@Article{DiStefano:1974:IIS,
  author =       "T. H. DiStefano and J. M. Viggiano",
  title =        "Interface Imaging by Scanning Internal Photoemission",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "94--99",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A scanning internal photoemission (SIP) technique is
                 used to obtain a high resolution map or image of the
                 potential energy barrier at an insulator interface. The
                 image is produced by displaying the internal
                 photocurrent produced by a monochromatic beam of light
                 scanned across the sample. A special technique was
                 developed for focusing the light to a spot less than
                 one micrometer in diameter. Photoemission images of a
                 Si-SiO$_2$ interface ``stained'' with a fractional
                 monolayer of sodium are presented along with
                 photoemission and reflectivity images of a
                 Nb$_2$O$_5$-Bi interface. These SIP images show
                 inhomogeneities related to structural variations,
                 impurities, and defects at the interface that
                 previously were inaccessible to observation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340Q (Metal-insulator-semiconductor structures);
                 B2530F (Metal-insulator-semiconductor structures)",
  classification = "701; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2/O/sub 5/-Bi interface; and defects; direct
                 microscopic image; insulator boundaries; interface
                 imaging; Nb/sub; photoemission; potential energy
                 barrier; scanning internal photoemission;
                 semiconductor; semiconductor devices;
                 semiconductor-insulator boundaries; Si-SiO/sub 2/
                 interface; structural variations, impurities",
  treatment =    "P Practical; X Experimental",
}

@Article{Huth:1974:CSD,
  author =       "B. G. Huth",
  title =        "Calculations of Stable Domain Radii Produced by
                 Thermomagnetic Writing",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "100--109",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Calculations are performed to determine the stable
                 radius of a cylindrically symmetric domain nucleated in
                 magneto-optical films during thermomagnetic writing
                 with a laser beam. A critical bound on domain size is
                 calculated which determines whether or not a domain of
                 given radius, once nucleated, will be stable. The
                 analysis shows that for a ferromagnetic material such
                 as MnAlGe, the domain dimensions can grow beyond the
                 local region of material that is heated above the Curie
                 temperature. For ferrimagnetic thin films having a
                 compensation point, T$_{comp}$, stability depends on
                 the difference between ambient and compensation
                 temperatures.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7570K (Domain structure in magnetic films (magnetic
                 bubbles)); A7820L (Magneto-optical effects (condensed
                 matter)); B3120N (Magnetic thin film devices); C5320E
                 (Storage on stationary magnetic media)",
  classification = "701; 721; 741; 744",
  corpsource =   "IBM., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "calculations of stable domain radii; data storage,
                 magnetic; ferrimagnetic thin; ferromagnetic material;
                 films; laser beam; laser beam applications; laser beams
                 --- Applications; magnetic domains; magnetic film;
                 magneto optical films; magneto-optical effects;
                 magnetooptical effects; magnetothermal effects; stores;
                 thermomagnetic writing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Reiser:1974:ADA,
  author =       "M. Reiser and H. Kobayashi",
  title =        "Accuracy of the Diffusion Approximation for Some
                 Queuing Systems",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "110--124",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25",
  MRnumber =     "51 \#9258",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents the results of a rather extensive
                 study of the accuracy of the diffusion approximation
                 technique as applied to queuing models. The motive for
                 using the diffusion process approximation here is to
                 develop realistic analytical models of computing
                 systems by considering service time distributions of a
                 general form. We first review the theory of the
                 diffusion approximation for a single server and then
                 develop a new and simplified treatment of queuing
                 network system. The accuracy of this approximation
                 method is then considered for a wide class of
                 distributional forms of service and interarrival times
                 and for various queuing models. The approximate
                 solutions and exact (or simulation) solutions are
                 compared numerically in terms of the means and
                 variances of queue sizes, server utilizations, the
                 asymptotic decrements of the distributions, and the
                 queue size distributions themselves. The accuracy of
                 the diffusion approximation is found to be quite
                 adequate in most cases and is considerably higher than
                 that obtained by an exponential server model that is
                 prevalent in computer system modeling.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C6150J (Operating systems)",
  classification = "723; 922",
  corpsource =   "IBM, Zurich, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accuracy; analytical models of computing systems;
                 asymptotic; computer metatheory; computer system;
                 continuous path Markov process; decrements; diffusion
                 approximation; function approximation; Markov
                 processes; modeling; models; probability; queue size
                 distributions; queue sizes; queueing theory; queuing
                 systems; server utilizations; supervisory and executive
                 programs; various queuing",
  reviewer =     "D. P. Gaver",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Anderson:1974:ISI,
  author =       "H. A. {Anderson, Jr.} and R. G. Sargent",
  title =        "Investigation into Scheduling for an Interactive
                 Computing System",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "125--137",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Description of a statistical evaluation of the
                 performance of the swap scheduling algorithm of an
                 interactive computer system and an investigation into
                 foreground-background scheduling to improve system
                 performance. Input traffic, computer service time
                 demands, and system performance were statistically
                 analyzed. Based on the results of these analyses
                 performance enhancements for the system were determined
                 and then evaluated through use of a validated
                 simulation model.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; computer service time demands; computer
                 systems, digital; foreground background; input traffic;
                 interactive computing system; operating systems
                 (computers); performance; scheduling; simulation model;
                 statistical; statistical analysis; swap scheduling
                 algorithm; system",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Kogge:1974:PSR,
  author =       "P. M. Kogge",
  title =        "Parallel Solution of Recurrence Problems",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "138--148",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D15",
  MRnumber =     "49 \#6552",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "307.65080",
  abstract =     "An mth-order recurrence problem is defined as the
                 computation of the sequence $x_1,\ldots{}, x_N$, where
                 $x_i$ equals $f(a_i, x_{i-1},\ldots{}, x_{i-m})$ and
                 $a_i$ is some vector of parameters. This paper
                 investigates general algorithms for solving such
                 problems on highly parallel computers. We show that if
                 the recurrence function f has associated with it two
                 other functions that satisfy certain composition
                 properties, then we can construct elegant and efficient
                 parallel algorithms that can compute all $N$ elements
                 of the series in time proportional to left bracket
                 log$_2$N right bracket. The class of problems having
                 this property includes linear recurrences of all orders
                 --- both homogeneous and inhomogeneous, recurrences
                 involving matrix or binary quantities, and various
                 nonlinear problems involving operations such as
                 computation with matrix inverses, exponentiation, and
                 modulo division.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290H (Linear algebra); C4140 (Linear algebra); C7310
                 (Mathematics computing)",
  classification = "723; 921",
  corpsource =   "IBM, Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "and modulo division; computation with matrix inverses;
                 computer programming; exponentiation,; linear algebra;
                 linear recurrences of all orders; mathematical
                 programming; nonlinear; nonlinear problems; numerical
                 methods; parallel algorithms; parallel processing;
                 parallel solution; problems; recurrence problems;
                 recurrences involving matrix or binary quantities",
  reviewer =     "E. M. Reingold",
  treatment =    "A Application; P Practical",
}

@Article{Gruenberg:1974:SMC,
  author =       "E. L. Gruenberg and H. P. Raabe and C. T. Tsitsera",
  title =        "Self-Directional Microwave Communication System",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "149--163",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Description of a communication system in which sending
                 and receiving terminals automatically generate beams
                 focused upon each other, which arise solely from
                 ambient noise. The terminals are amplifying
                 retrodirective arrays of antenna elements. Analysis and
                 experiment are used to prove and verify the system
                 concept. Some engineering considerations pertinent to
                 system operation under various conditions are also
                 analyzed and discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5270D (Antenna arrays); B6250F (Mobile radio
                 systems)",
  classification = "716",
  corpsource =   "IBM, Morris Plains, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "ambient noise; communication system; directive antenna
                 arrays; directive antennas; links; microwave; microwave
                 antenna arrays; microwave communication system; mobile
                 radio systems; noise; radio systems, mobile;
                 retrodirective arrays; self directional",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Kobayashi:1974:IDC,
  author =       "H. Kobayashi and L. R. Bahl",
  title =        "Image data compression by predictive coding. {I}.
                 Prediction algorithms",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "164--171",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Predictive coding techniques for efficient
                 transmission or storage of two-level (black and white)
                 digital images are dealt with.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6140 (Signal processing and
                 detection); C1260 (Information theory); C7410F
                 (Communications computing)",
  classification = "723; 731",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adaptive linear predictor; adaptive predictor with
                 finite; algorithms; codes, symbolic; communications
                 applications of computers; data compression; digital
                 signals; encoding; fixed predictor; image data
                 compression; information theory --- Filtering and
                 Prediction Theory; memory; prediction; predictive
                 coding; two level digital images; video signals",
  treatment =    "P Practical; X Experimental",
}

@Article{Bahl:1974:IDC,
  author =       "L. R. Bahl and H. Kobayashi",
  title =        "Image data compression by predictive coding. {II}.
                 Encoding algorithms",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "2",
  pages =        "172--179",
  month =        mar,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Predictive coding techniques for efficient
                 transmission or storage of two-level (black and white)
                 digital images are examined. Algorithms for prediction
                 are discussed as well as coding techniques for encoding
                 the prediction error pattern. First, the authors survey
                 some schemes for encoding if the error pattern is
                 assumed to be memoryless. Then a method is developed
                 for encoding certain run-length distributions. Finally,
                 some experimental results for sample documents are
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6140 (Signal processing and
                 detection); C1260 (Information theory); C7410F
                 (Communications computing)",
  classification = "723; 731",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; applications of computers; codes,
                 symbolic; communication; communications applications of
                 computers; data compression; digital signals; encoding;
                 image data compression; information theory ---
                 Filtering and Prediction Theory; predictive coding; two
                 level digital images; video signals",
  treatment =    "P Practical; X Experimental",
}

@Article{Chow:1974:OSH,
  author =       "C. K. Chow",
  title =        "On Optimization of Storage Hierarchies",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "194--203",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90C50 (68A50 90B05)",
  MRnumber =     "52 \#12803",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A simple model of the storage hierarchies is
                 formulated with the assumptions that the effect of the
                 storage management strategy is characterized by the hit
                 ratio function. The hit ratio function and the device
                 technology-cost function are assumed to be
                 representable by power functions (or piece-wise power
                 functions). The optimization of this model is a
                 geometric programming problem. An explicit formula for
                 the minimum hierarchy access time is derived; the
                 technology of each storage level are determined. The
                 optimal number of storage levels in a hierarchy is
                 shown to be directly proportional to the logarithm of
                 the systems capacity with the constant of
                 proportionality dependent upon the technology and hit
                 ratio characteristics. The optimal cost ratio of
                 adjacent storage levels is constant, as are the ratios
                 of the device access times and storage capacities of
                 the adjacent levels. An illustration of the effect of
                 overhead cost and level-dependent cost, such as the
                 cost per ``box'' and cost of managing memory faults is
                 given and several generalizations are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cost function; data storage units; device access
                 times; device technology; economics; explicit formula;
                 function; geometric programming problem; hierarchy
                 access time; hit ratio; mathematical models; memory
                 hierarchy, Performance Evaluation: Analytic; minimum;
                 modelling; number of levels; optimal cost ratio;
                 optimisation; power functions; storage capacities;
                 storage hierarchies; storage levels; storage
                 management; storage management strategy; systems
                 capacity",
  treatment =    "E Economic; T Theoretical or Mathematical",
}

@Article{Karnaugh:1974:LPT,
  author =       "M. Karnaugh",
  title =        "Loss of Point-To-Point Traffic in Three-Stage Circuit
                 Switches",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "204--216",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A theoretical study is made of simple analytical
                 models for the point-to-point loss of telecommunication
                 traffic caused by blocking in three-stage circuit
                 switches. Two new models are compared with Jacobaeus'
                 frequently used model and with some simulation results
                 to determine regions of acceptable accuracy. The
                 effects of random hunting and sequential hunting for
                 routes are compared by simulation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6150 (Communication system theory); B6230 (Switching
                 centres and equipment)",
  classification = "713; 718",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytical models; blocking by switching; division
                 link systems; electronic circuits, switching; hunting;
                 Jacobaeus model; loss models; matrix switches; point to
                 point traffic; random; route; sequential hunting;
                 simulation results; space; switching systems;
                 telecommunication traffic; telephone switching
                 equipment; theoretical study; three stage circuit
                 switching; three stage switches; time division link
                 systems; traffic",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lukes:1974:EAP,
  author =       "J. A. Lukes",
  title =        "Efficient Algorithm for the Partitioning of Trees",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "217--224",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05 (05C05)",
  MRnumber =     "49 \#10176",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an algorithm for partitioning a
                 graph that is in the form of a tree. The algorithm has
                 a growth in computation time and storage requirements
                 that is directly proportional to the number of nodes in
                 the tree. Several applications of the algorithm are
                 briefly described. In particular it is shown that the
                 tree partitioning problem frequently arises in the
                 allocation of computer information to blocks of
                 storage. Also, a heuristic method of partitioning a
                 general graph based on this algorithm is suggested.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "921",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "allocation of computer; applications; computation
                 time; efficient algorithm; general graph partitioning;
                 heuristic method; information; mathematical
                 programming, dynamic; partitioning of trees;
                 requirements; storage; storage allocation; trees
                 (mathematics)",
  reviewer =     "A. K. Dewdney",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Rottmann:1974:PIC,
  author =       "H. R. Rottmann",
  title =        "Photolithography in Integrated Circuit Mask
                 Metrology",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "225--231",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Photoresist technology is shown to have important
                 advantages over the use of high resolution silver
                 halide films in dimensional metrology for integrated
                 circuit masks. Experimental techniques are shown for
                 the use of photoresist and chrome images in the study
                 of image quality and uniformity and in analysis of the
                 causes of image degradation. This method is applied to
                 in situ lens evaluation and to the measurement of the
                 precision of photorepeater stepping tables used in mask
                 fabrication. In addition, the value of 0.3 $\mu$ m is
                 established as the practical limit of dimensional
                 tolerance in the present photolithographic technology,
                 and its significance to the advancement of the state of
                 the art in mask manufacture is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4285 (Optical testing and workshop techniques); B2220
                 (Integrated circuits); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 742",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "causes of image; degradation; dimensional metrology;
                 dimensional tolerance; experimental; image quality;
                 image uniformity; integrated circuit mask metrology;
                 integrated circuit production; integrated circuits;
                 lens evaluation; lenses; measurement; mechanical
                 variables; optical images; photography;
                 photolithography; photolithography:; photoresist
                 technology; precision of photorepeater; silver halide
                 films; stepping tables: mask fabrication; techniques:
                 chrome images",
  treatment =    "X Experimental",
}

@Article{Lanza:1974:AAG,
  author =       "C. Lanza",
  title =        "Analysis of an {AC} Gas Display Panel",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "232--243",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The details and results for a one-dimensional
                 numerical analysis of the gaseous discharge occurring
                 at a single intersection of an AC gas panel are
                 reported. A particular object of the program is the
                 determination of the electric field magnitude as a
                 function of both position and time, taking into account
                 the field distortion due to the space charge. The
                 calculations are based on the Townsend avalanche
                 mechanism but omit the dynamic role of metastable neon
                 atoms in a Penning gas mixture. The calculated
                 electrical properties of the panel are compared with
                 experimental values.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2380 (Gas discharge tubes and devices)",
  classification = "701; 804; 942",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas display; analysis; avalanche mechanism;
                 calculated; display systems; electric discharges;
                 electric field determination; electrical properties;
                 experimental results; field distortion; gas-discharge
                 tubes; gaseous discharge; gases, inert; instruments;
                 intersection; modelling; numerical analysis; one
                 dimensional analysis; panel; Penning gas mixture;
                 single; space charge; Townsend",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Lay:1974:SCO,
  author =       "F. M. Lay and C. K. Chu and P. H. Haberland",
  title =        "Simulation of Cyclic Operation of a Gas Panel Device",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "244--249",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a numerical simulation model for
                 the operation of a gas panel discharge cell with a
                 neon-argon mixture. The model is based on a Townsend
                 avalanche or direct ionization mechanism and secondary
                 emission, as well as Penning collisions or indirect
                 ionization. Charges on the dielectric walls are
                 included, but space-charge field distortion is
                 neglected. Cyclic operation of the cell is studied in
                 detail and the effects of geometric and electrical
                 parameters (e.g., gap and pulse widths) on the
                 operating characteristics of the cell (e.g., write,
                 sustain and erase voltages) have been obtained. The
                 results are in good agreement with experimental data
                 where available.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2380 (Gas discharge tubes and devices)",
  classification = "804; 921; 942",
  corpsource =   "IBM, Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "characteristics; charges; collisions; cyclic
                 operation; dielectric wall; direct; display systems;
                 electrical parameters; erase voltage; gas panel device;
                 gas panel discharge cell; gas-discharge tubes; gases,
                 inert; geometric parameters: sustain voltage;
                 instruments; ionization mechanism; mathematical models;
                 modelling; Ne-Ar mixture: Townsend avalanche mechanism;
                 numerical simulation model; operating; Penning;
                 secondary emission; simulation; voltage; write",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Birman:1974:PCM,
  author =       "A. Birman",
  title =        "On Proving Correctness of Microprograms",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "250--266",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "49 \#8412",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the results of an investigation
                 in proving the correctness of microprograms. The
                 vehicle used is the S-machine, which is a very simple
                 ``paper'' computer. The approach to the proof of
                 correctness is based on formally defining the
                 machine-instruction level and the microprogramming
                 level of the given machine, and then showing that these
                 ``interfaces'' are equivalent through the use of a
                 concept called algebraic simulation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C5220 (Computer
                 architecture)",
  classification = "722; 723",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algebraic simulation; computer operating systems; data
                 storage units; interface equivalence; level;
                 microprogramming; microprogramming level;
                 microprograms; paper computer: machine instruction;
                 proving correctness; s-machine; S-machine; simulation",
  reviewer =     "W. D. Maurer",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Godard:1974:CEU,
  author =       "D. Godard",
  title =        "Channel Equalization Using a {Kalman} Filter for Fast
                 Data Transmission",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "267--273",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is shown how a Kalman filter may be applied to the
                 problem of setting the tap gains of transversal
                 equalizers to minimize mean-square distortion. In the
                 presence of noise and without prior knowledge about the
                 channel, the filter algorithm leads to faster
                 convergence than other methods, its speed of
                 convergence depending only on the number of taps.
                 Theoretical results are given and computer simulation
                 is used to corroborate the theory and to compare the
                 algorithm with the classical steepest descent method.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1270 (Filters and other networks); B1290 (Other
                 analogue circuits); B6140 (Signal processing and
                 detection); C1260 (Information theory)",
  classification = "722; 723; 731",
  corpsource =   "IBM, Alpes Maritimes, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; channel equalisation; classical steepest
                 descent method; computer simulation; computers --- Data
                 Communication Systems; control systems; data
                 transmission equipment; distortion minimisation;
                 equalisers; fast convergence; fast data transmission;
                 filter algorithm; Kalman filter; Kalman filters; mean
                 square; noise; tap gain setting; theoretical results;
                 transversal equalisers",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Channel equalisation using a {Kalman} filter for fast
                 data transmission",
}

@Article{Tang:1974:SAG,
  author =       "T. Tang",
  title =        "Stress Analysis of Glass-Bonded Ferrite Recording
                 Heads",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "3",
  pages =        "274--278",
  month =        may,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Glass-bonded ferrite recording heads are subject to
                 appreciable thermal stress because of the difference in
                 thermal expansion between glass and ferrite in the
                 temperature range of the glassing cycle. A theoretical
                 analysis reveals the complexity of stress distributions
                 in the structure and pinpoints the critically stressed
                 areas in which a potential fracture or a magnetic
                 degradation of the material may occur. It is found that
                 the stresses are sensitive not only to the thermal
                 mismatch of the component materials but also to the
                 structural configuration. Low stress levels can be
                 achieved by matching expansions of the materials and by
                 proper head design, particularly in the optimization of
                 fillet angle and fillet height.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120 (Magnetic material
                 applications and devices); B6450 (Audio equipment and
                 systems)",
  classification = "721",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic; design engineering;
                 distributions: critically stressed areas; expansion;
                 ferrite devices; fillet angle: fillet height; glass;
                 glass bonded ferrite; glassing cycle: theoretical
                 analysis: stress; instruments --- Recording; low stress
                 level design; magnetic heads; optimisation; recording
                 heads; stress analysis; stresses --- Thermal;
                 structural configuration; thermal; thermal mismatch;
                 thermal stress",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Low:1974:OPU,
  author =       "D. W. Low",
  title =        "Optimal Pricing for an Unbounded Queue",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "290--302",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25",
  MRnumber =     "56 \#3970",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The maximization of expected reward is considered for
                 an M$_p$/M/s queueing system with unlimited queue
                 capacity. The system is controlled by dynamically
                 changing the price charged for the facility's service
                 in order to discourage or encourage the arrival of
                 customers. For the finite queue capacity problem, it
                 has been shown that all optimal policies possess a
                 certain monotonicity property, namely, that the optimal
                 price to advertise is a non-decreasing function of the
                 number of customers in the system. The main result
                 presented here is that for the unlimited capacity
                 problem, there exist optimal stationary policies at
                 least one of which is monotone. Also, an algorithm is
                 presented, with numerical results, which will produce
                 an epsilon -optimal policy for any epsilon less than 0,
                 and an optimal policy if a simple condition is
                 satisfied.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C1330 (Optimal control)",
  classification = "922",
  corpsource =   "IBM, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; economics; epsilon optimal policy; expected
                 reward; maximization of; monotonicity; optimal control;
                 optimal pricing; optimal stationary policies;
                 probability; queueing theory; unlimited queue
                 capacity",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{King:1974:ESP,
  author =       "W. F. {King III} and S. E. Smith and I. Wladawsky",
  title =        "Effects of Serial Programs in Multiprocessing
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "303--309",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model of a multiprocessing, multiprogramming
                 computer system with serially reusable programs was
                 developed to study the effect of serial programs on
                 system performance. Two strategies for implementing
                 serially reusable programs were investigated, a wait
                 strategy in which the processor waits until the serial
                 program is available, and a switch strategy, in which
                 the processor is freed to do other work. Relative
                 performances and asymptotic conditions as functions of
                 the number of processors, processes, serially reusable
                 programs, and the fraction of time each process
                 executes serially reusable programs were obtained.
                 Quantitative results are presented showing that the
                 switch strategy is superior. The wait strategy causes
                 quick saturation when the number of processes is
                 increased.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6150J
                 (Operating systems)",
  classification = "723",
  corpsource =   "IBM, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; multiprocessing systems;
                 multiprogramming; multiprogramming computer system;
                 programming; serially reusable programs; strategy;
                 switch; system performance; theory; wait strategy",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{Kaneko:1974:OTS,
  author =       "T. Kaneko",
  title =        "Optimal Task Switching Policy for a Multilevel Storage
                 System",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "310--315",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Capacity demands for computer memory are increasing. A
                 multilevel storage system provides an economically
                 feasible solution without seriously affecting the total
                 response time. An M-level storage system is considered
                 in this paper. The capability of a digital computer
                 with a multilevel storage system is best enhanced in a
                 multiprogramming environment. In a high level storage
                 system, determination of a best task switching policy
                 becomes an important consideration. In this paper, a
                 queueing network is introduced to describe distribution
                 and flow of tasks in the system. An optimal switching
                 policy is determined in relation to the system's
                 overhead time. It is shown that in heavily CPU-limited
                 cases, the determination becomes a very simple one;
                 namely, the best policy is given as the threshold level
                 at which the accumulation of the average access time
                 exceeds the overhead time.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1330 (Optimal control); C4290 (Other computer
                 theory); C5310 (Storage system design); C6150J
                 (Operating systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "average access time; best; computation theory;
                 computer memory; computer operating systems; design of
                 computer storage systems; digital storage; hierarchical
                 systems; high level storage system; multilevel storage;
                 multiprogramming; optimal systems; overhead time;
                 queueing network; queueing theory; system; task
                 switching policy",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{Gecsei:1974:DHR,
  author =       "J. Gecsei",
  title =        "Determining Hit Ratios for Multilevel Hierarchies",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "316--327",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "49 \#6705",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The applicability of stack processing for evaluation
                 of storage hierarchies has been limited to two-level
                 systems and to a very special group of multilevel
                 hierarchies. A generalization of stack processing,
                 called joint stack processing, is introduced. This
                 technique makes possible the efficient determination of
                 hit ratios for a class of multilevel hierarchies ---
                 staging hierarchies. These hierarchies are rather
                 realistic in the sense that they allow for multiple
                 block sizes and multiple copies of data in the
                 hierarchy. Properties of storage management schemes
                 that lend themselves to joint stack processing are
                 studied, and the notion of distributed hierarchy
                 management is described and illustrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "C0310 (EDP management); C5310 (Storage system design);
                 C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Canada, Marie, Montreal, Que., Canada",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer selection and
                 evaluation; copies of data; digital storage;
                 distributed; efficient determination of hit; evaluation
                 of storage hierarchies; hierarchical systems; hierarchy
                 management; joint stack processing; memory hierarchy,
                 Performance Evaluation: Analytic; multilevel
                 hierarchies; multiple; multiple block sizes; ratios;
                 staging hierarchies; storage management; storage
                 management schemes",
  reviewer =     "A. L. Rosenberg",
  treatment =    "A Application",
  xxnote =       "Check month: June or July??",
}

@Article{Hanan:1974:ITL,
  author =       "M. Hanan and A. Mennone and P. K. {Wolff, Sr.}",
  title =        "Iterative-Interactive Technique for Logic
                 Partitioning",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "328--337",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method is developed for partitioning a computer
                 logic design into subsets by combining a constructive
                 method, used for the initial partition, with iterative
                 improvement techniques. These iterative techniques are
                 implemented in an interactive computing environment,
                 which further enhances their efficiency and usefulness.
                 An overview of the system is presented, several
                 algorithms discussed and experimental results given.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210B (Computer-aided logic design)",
  classification = "721; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computer-aided logic design; constructive
                 method; efficiency; improvement techniques; interactive
                 computing; interactive terminals; iterative; iterative
                 methods; logic design; logic partitioning; subsets;
                 usefulness",
  treatment =    "P Practical",
  xxnote =       "Check month: June or July??",
}

@Article{Choquet:1974:MMT,
  author =       "M. F. Choquet and H. J. Nussbaumer",
  title =        "Microcoded Modem Transmitters",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "338--351",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes various microcoded designs for
                 modem transmitters. The digital echo modulation
                 technique, originally introduced by J-M. Pierret, is
                 applied to cover the case of a fully digital universal
                 modem. The capabilities of several microcoded modem
                 designs are presented and their limitations are
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1250 (Modulators, demodulators, discriminators and
                 mixers); B6120B (Codes); B6120 (Modulation methods);
                 C5600 (Data communication equipment and techniques)",
  classification = "716; 718",
  corpsource =   "IBM France, Alpes Maritimes, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "digital communication systems; digital echo
                 modulation; digital universal modem; microcoded;
                 microcoded modem transmitter; modem designs; modem
                 transmitters; modems; modulation; pulse-code;
                 transmitters",
  treatment =    "A Application",
  xxnote =       "Check month: June or July??",
}

@Article{Kyser:1974:QEM,
  author =       "D. F. Kyser and K. Murata",
  title =        "Quantitative Electron Microprobe Analysis of Thin
                 Films on Substrates",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "352--363",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Monte Carlo simulation procedure is developed for
                 kilovolt electron beam scattering and energy loss in
                 targets consisting of thin films on thick substrates.
                 Such calculations have direct application to the
                 nondestructive quantitative chemical analysis of
                 ultrathin films in the electron trajectory simulation
                 with the screened Rutherford expression for
                 cross-section, and energy loss between elastic
                 scattering events is calculated with the
                 continuous-slowing-down approximation of Bethe. The
                 contribution to x-ray fluorescence from the film due to
                 backscattered electrons from the substrate is accounted
                 for.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0250 (Probability theory, stochastic processes, and
                 statistics); A6114 (Electron determination of
                 structures); A6180F (Electron and positron effects);
                 A6180M (Channelling, blocking and energy loss of
                 particles); A6855 (Thin film growth, structure, and
                 epitaxy); A6860 (Physical properties of thin films,
                 nonelectronic); A8280 (Chemical analysis and related
                 physical methods of analysis)",
  classification = "714; 801",
  corpsource =   "IBM, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alloy films; electron; electron microprobe analysis;
                 electron probe analysis; electron scattering; energy
                 loss; energy loss of; films; fluorescence; intensity
                 ratios; kilovolt electron beam scattering; Monte Carlo
                 methods; monte carlo simulation; particles; procedure;
                 thin films; thin films on thick substrates; trajectory
                 simulation; X-ray; X-ray fluorescence",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{Lee:1974:DFL,
  author =       "H. C. Lee",
  title =        "Drop Formation in a Liquid Jet",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "364--369",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A one-dimensional analysis of drop formation in a
                 liquid jet is developed under the assumption that the
                 axial velocity of the axisymmetric, nonviscous liquid
                 jet remains independent of the radial coordinate. The
                 resulting equations are used for both linear and
                 nonlinear analyses. In the linear form, this model
                 provides a stream stability relation comparable to that
                 of Rayleigh: transient solutions are obtained for given
                 initial conditions of an infinite stream. For the
                 nonlinear equations, numerical simulation was done to
                 study the satellite drop formation; with the present
                 model, the satellite drop is always formed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); A4755K (Multiphase
                 flows)",
  classification = "631",
  corpsource =   "IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "drops; flow of fluids; jets; nonviscous liquid jet;
                 satellite drop formation; solutions; stream stability
                 relation; transient",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{Chang:1974:BQM,
  author =       "W. Chang",
  title =        "Bulk Queue Model for Computer System Analysis",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "4",
  pages =        "370--372",
  month =        jun,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30",
  MRnumber =     "49 \#6418",
  bibdate =      "Sat Feb 24 09:26:14 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See comment \cite{Stacy:1975:CBQ}.",
  abstract =     "A bulk queue model was developed for analyzing a
                 multiprogrammed computer system. It can be used in
                 conjunction with closed queueing models to study
                 message queueing in a teleprocessing system. The model
                 is based on an imbedded Markov chain analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6150J
                 (Operating systems)",
  classification = "723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; bulk queue model; computer metatheory;
                 computer system; computer system analysis; computer
                 systems programming --- Multiprogramming; imbedded
                 Markov chain analysis; modelling; multiprogrammed;
                 multiprogramming; queueing theory; systems",
  reviewer =     "J. G. C. Templeton",
  treatment =    "T Theoretical or Mathematical",
  xxnote =       "Check month: June or July??",
}

@Article{Ho:1974:IPD,
  author =       "P. S. Ho and R. Benedek",
  title =        "Interatomic Potentials and Defect Energetics in Dilute
                 Alloys",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "386--394",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is divided into two parts. The first
                 describes the construction of the interatomic potential
                 within the framework of pseudopotential theory. Based
                 on a local model potential, size and valence factors
                 are defined and their effect on the pair potentials
                 discussed. The second part deals with the calculation
                 of the impurity-vacancy binding energy and the
                 difference in diffusion activation energies for an
                 impurity and a host atom. Here, considerable effort has
                 been spent in the calculation of lattice relaxation
                 energies. For this purpose the Green's function
                 formulation of lattice statics has been used. The
                 results, particularly for migration energies, show that
                 lattice relaxation has a large effect.
                 Nontransition-metal impurities in aluminum were chosen
                 as the subject of numerical calculations. This choice
                 was motivated by the validity of the pseudopotential
                 approach for aluminum and also the existence of some
                 recent data for impurity diffusion and vacancy-solute
                 binding energies.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170R (Crystal impurities: general); A6630J
                 (Diffusion, migration, and displacement of impurities
                 in solids)",
  classification = "531",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aluminium; binding energy; boundaries; dielectric
                 screening; diffusion; diffusion in solids; dilute
                 alloys; Green's function; impurities; impurity vacancy;
                 interatomic potentials; lattice relaxation; metals and
                 alloys; nontransition metal; pseudopotential; theory;
                 vacancies (crystal)",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bogy:1974:SSC,
  author =       "D. B. Bogy and H. J. Greenberg and F. E. Talke",
  title =        "Steady Solution for Circumferentially Moving Loads on
                 Cylindrical Shells",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "395--400",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "295.73071",
  abstract =     "The steady, forced-wave solution is obtained for loads
                 that travel with constant speed on a simply supported
                 circular shell, the motion of which is damped
                 externally by air. Critical speeds are identified above
                 which the waveform, which is a standing wave in moving
                 coordinates, exhibits shorter wavelengths in front of
                 the load than behind it. At supercritical speeds the
                 solution becomes unbounded, because of loss of
                 stability, in the limit of no damping.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0320 (Classical mechanics of discrete systems:
                 general mathematical aspects); A0340D (Mathematical
                 theory of elasticity); A4610 (Mechanics of discrete
                 systems); A4630M (Vibrations, aeroelasticity,
                 hydroelasticity, mechanical waves, and shocks)",
  classification = "408; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; constant; critical speed; cylindrical
                 shells; damping; domes and shells; effects; mechanical
                 oscillations; membrane; resonant conditions; rotating
                 bodies; speed; stability; standing wave; steady forced
                 wave solution; waveform; wavelengths",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Donath:1974:EMR,
  author =       "W. E. Donath",
  title =        "Equivalence of memory to {``random logic''}",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "401--407",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "57 \#15753",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model of the design process for computer logic is
                 used to estimate the number of bits of memory required
                 to replace a so-called ``random-logic'' circuit. The
                 model can also be used to compare the respective time
                 delays of array logic and random logic.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210 (Logic design methods); C5320G (Semiconductor
                 storage)",
  classification = "721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array logic; design; equivalence; equivalence ratio;
                 expansion process; logic design; memory; process;
                 random logic; semiconductor storage systems; time
                 delays",
  treatment =    "A Application; P Practical",
}

@Article{Ghosh:1974:SPS,
  author =       "S. P. Ghosh and M. E. Senko",
  title =        "String Path Search Procedures for Data Base Systems",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "408--422",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "51 \#9590",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper structures algorithms for the translation
                 of set theoretic queries into procedures for the search
                 of arbitrary complex networks constructed on a data
                 base using three basic types of strings. A method for
                 parametrization of queries which is appropriate for
                 accessing string structures is outlined and it is shown
                 how the properties of string structures can be used to
                 construct an algorithm for finding a search path with
                 minimum path cardinality for a given query addressed to
                 such a network. (The term data management system is
                 used instead of data base management system).",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C7100 (Business and
                 administration)",
  classification = "723; 901",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; base systems; core type storage media;
                 data; data management system; data processing --- Data
                 Handling; data structures; file organisation;
                 information science; management information; minimum
                 path cardinality; query language; search path; software
                 system; string selection criterion; string structures;
                 systems",
  reviewer =     "I. Kaufmann",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Gaver:1974:AED,
  author =       "D. P. Gaver and P. A. W. Lewis and G. S. Shedler",
  title =        "Analysis of Exception Data in a Staging Hierarchy",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "423--435",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "305.68053",
  abstract =     "This paper is an analysis of program address trace
                 data in a demand-paged computer system with a
                 three-level staging hierarchy. The primary objective is
                 to explore the data both graphicaly and numerically,
                 using methods that may be useful when other data traces
                 become available. In addition, plausible point-process
                 type models are fit to the data. Such an approach,
                 combining data-analytic procedures with probability
                 modeling, should prove useful in understanding program
                 behavior and thus will aid in the rational design of
                 complex computer systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150G (Diagnostic,
                 testing, debugging and evaluating systems); C6150J
                 (Operating systems)",
  classification = "723",
  corpsource =   "Naval Postgraduate School, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer metatheory --- Programming Theory; computer
                 systems programming; computer testing; data traces;
                 demand paged computer system; exception data; graphical
                 method; memory hierarchy, Performance Evaluation:
                 Experimental; multiprogramming; point process;
                 probability modelling; program address trace data;
                 program tapes; statistical data analysis; three level
                 staging hierarchy; virtual storage",
  treatment =    "A Application; P Practical",
}

@Article{Chang:1974:SDF,
  author =       "W. H. Chang and L. G. Heller",
  title =        "Structure Dependence of Free-Charge Transfer in
                 Charge-Coupled Devices",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "436--442",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A detailed numerical analysis of charge-coupled-device
                 (CCD) charge transfer is described and discussed. The
                 analysis is based on solving the transport equation
                 with a time-dependent surface field calculated from the
                 actual device configuration. Devices with different
                 oxide thicknesses and devices with electrode gaps are
                 examined. The total field is found to play an important
                 role in charge transfer for all cases studied. The
                 effective channel length is modulated by the net field
                 present and is a function of time and electrode
                 configuration. The transfer is found fastest and the
                 effective channel length shortest when the charge is
                 transferred from a region of low oxide capacitance into
                 a region of high oxide capacitance. A low-capacitance
                 electrode gap slows the charge transfer process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  classification = "714",
  corpsource =   "IBM, Burlington, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CCD; characteristic; charge coupled devices; charge
                 exchange; charge-coupled devices; effective channel
                 length; electrode configuration; electrode gaps;
                 numerical analysis; oxide capacitance; oxide
                 thicknesses; potential wells; semiconductor devices,
                 mis; time dependent surface field; transfer; transport
                 equation",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Hong:1974:MHA,
  author =       "S. J. Hong and R. G. Cain and D. L. Ostapko",
  title =        "{MINI}: a heuristic approach for logic
                 minimization",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "443--458",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "54 \#12384",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A general two-level logic function minimization
                 technique, MINI, is described. The MINI process does
                 not generate all prime implicants nor perform the
                 covering step required in a classical two-level
                 minimization. Rather, the process uses a heuristic
                 approach that obtains a near minimal solution in a
                 manner which is efficient in both computing time and
                 storage space. MINI is based on the positional cube
                 notation in which groups of inputs and the outputs form
                 separate coordinates. Regular Boolean minimization
                 problems are handled as a particular case. The
                 capability of handling multiple output functions is
                 implicit.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4230 (Switching theory)",
  classification = "723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approach; Boolean functions; Boolean logic; computer
                 metatheory; conventional logic; expanding; heuristic;
                 input output table; Karnaugh map; MINI; minimal
                 implicant solution; minimisation of switching nets;
                 minterm; multivalued variables; prime implicants;
                 removing redundancy from cubes; reshaping;
                 subprocesses",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Ostapko:1974:GTE,
  author =       "D. L. Ostapko and S. J. Hong",
  title =        "Generating Test Examples for Heuristic {Boolean}
                 Minimization",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "5",
  pages =        "459--464",
  month =        sep,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "55 \#14432",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This article describes simple methods of generating
                 many-variable test-case problems for heuristic logic
                 minimization studies. Covering problems and coloring
                 problems are converted into Boolean functions that are
                 useful test cases for minimization.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4230 (Switching theory)",
  classification = "723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Boolean; Boolean functions; cases; colouring problems;
                 computer metatheory; covering problems; degree of
                 minimality; don't care; heuristic logic; many variable
                 test cases; minimisation of switching nets;
                 minimization; minterm; symmetric function; test",
  reviewer =     "H. R. Hwa",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Lennemann:1974:AAD,
  author =       "E. Lennemann",
  title =        "Aerodynamic Aspects of Disk Files",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "480--488",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Airflows between centrally clamped, rotating, rigid
                 disks are investigated with respect to the type of flow
                 pattern, the parameters that influence nonuniform flow,
                 and the effects of various flow patterns on disk
                 stability. The experimental method uses a water-flow
                 modeling technique for the airflow. The observed flow
                 patterns are highly unsteady. The configuration and
                 position of the shroud and slider arm are found to be
                 the major parameters that influence flow
                 characteristics. A reduction of disk flutter by a
                 factor of 12 can be achieved when the unsteady flow
                 pattern is changed to a steady flow pattern.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM, Deutschland GmbH., Boeblingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerodynamics; airflows; data storage, magnetic; disc
                 stability; flow pattern; flutter; magnetic disc and
                 drum storage; magnetic disc files; modelling;
                 random-access storage; rotating bodies; shroud; slider
                 arm; stability; water flow",
  treatment =    "X Experimental",
}

@Article{Mulvany:1974:EDD,
  author =       "R. B. Mulvany",
  title =        "Engineering Design of a Disk Storage Facility with
                 Data Modules",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "489--505",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design of the IBM 3340 Direct Access Storage
                 Facility with IBM 3348 Data Modules incorporates new
                 concepts and required the development of several
                 innovative components, including newly designed
                 magnetic read-write heads. The heads start and stop in
                 contact with the disk and use a tri-rail, air-bearing
                 slider having a low mass. Each data module includes
                 read-write heads, a head carriage, disks, and a disk
                 spindle. The rationale is discussed for the design
                 concepts and for several components, including the data
                 module, head and arm assembly, and the moving-coil
                 linear actuator. A method of improving data integrity,
                 utilizing a ``disk-defect skipping'' procedure, is
                 described and its performance implications discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3260B (Electric actuators and final control
                 equipment); C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "concepts; data integrity; data modules; data storage,
                 magnetic; design; design engineering; disc defect
                 skipping; drum storage; electric actuators; head and
                 arm assembly; head carriage; magnetic disc and;
                 magnetic disc storage facility; magnetic heads;
                 magnetic read/write heads; moving coil linear actuator;
                 security of data; storage; three rail air bearing
                 slider; units",
  treatment =    "P Practical",
}

@Article{Oswald:1974:DDF,
  author =       "R. K. Oswald",
  title =        "Design of a Disk File Head-Positioning Servo",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "506--512",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The engineering design of a head-positioning system
                 for an interchangeable-medium disk file is considered.
                 Emphasis is placed upon three specific functions within
                 the positioning system: encoding and demodulation of
                 information from the dedicated servo surface,
                 compensation and dynamics of the track-following
                 control system, and implementation of control
                 electronics for a quasi-time-optimal, track-assessing
                 control system. The examples used are taken from the
                 IBM 3340 Disk Storage Facility.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3120C (Spatial variables control); C3200 (Control
                 equipment and instrumentation); C5320 (Digital
                 storage)",
  classification = "721; 722",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compensation; control electronics; data storage,
                 magnetic; demodulation; design engineering; disc and
                 drum storage; encoding; engineering design; error
                 compensation; head positioning servo; interchangeable
                 medium disc file; magnetic; magnetic heads; position
                 control; servomechanisms; track accessing; track
                 following",
  treatment =    "A Application; P Practical",
}

@Article{Stahl:1974:DRS,
  author =       "K. J. Stahl and J. W. White and K. L. Deckert",
  title =        "Dynamic Response of Self-Acting Foil Bearings",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "513--520",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new approach to the analysis of wide foil bearings
                 is investigated. The equation of motion for a finite
                 length of tape is coupled to the transient lubrication
                 equation for the air film between the tape and the
                 recording head. Compressibility and slip flow are
                 retained in the fluid mechanics equation; flexural
                 rigidity and high-speed dynamic effects are retained in
                 the tape equation. The steady-state solution to the
                 coupled equations is obtained as the limiting case of
                 the transient initial value problem. Describing the
                 system equations relative to the undeflected tape (as
                 opposed to conventional foil-bearing theory, which uses
                 the head as the reference surface) permits
                 investigation of noncircular head geometries. In
                 addition, wave propagation effects in the tape and the
                 interaction of waves in the tape with the air-bearing
                 region may be studied.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320 (Digital storage)",
  classification = "601",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air film; bearings; compressibility; dynamic response;
                 equation of motion; finite length of tape; flexural
                 rigidity; foil bearings; machine bearings; magnetic
                 tape equipment; noncircular head geometries; recording
                 head; self acting foil bearings; slip flow; transient
                 initial value problem; transient lubrication equation;
                 wave propagation effects; wide",
}

@Article{Vogel:1974:WLI,
  author =       "S. M. Vogel and J. L. Groom",
  title =        "White Light Interferometry of Elastohydrodynamic
                 Lubrication of Foil Bearings",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "521--528",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an experiment performed to verify
                 the one-dimensional model of elastic foil behavior
                 developed by K. S. Stahl, J. W. White,K. L. Decker. In
                 the experiment, a loop of tape one inch wide passes
                 over a stationary recording head and the air-film
                 thickness between the head and the foil is determined
                 using white light interferometry. Measured data for
                 various experimental conditions are compared with the
                 predictions of the model and also with prior
                 foil-bearing analyses. The influence of parameters such
                 as tape thickness, head radius, tape tension, etc., on
                 the nature of the spacing field is demonstrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A0760L
                 (Optical interferometry); C5320 (Digital storage)",
  classification = "601",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bearings; elastohydrodynamic lubrication of foil
                 bearings; head radius; light interferometry;
                 lubrication; machine bearings; magnetic tape equipment;
                 model; recording head; spacing field; stationary; tape;
                 tape tension; thickness; thickness measurement; white
                 light interferometry",
  treatment =    "X Experimental",
}

@Article{Fleischer:1974:ILI,
  author =       "J. M. Fleischer and C. Lin",
  title =        "Infrared Laser Interferometer for Measuring
                 Air-Bearing Separation",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "529--533",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design and characteristics are presented for an
                 infrared instrument capable of measuring air-bearing
                 separation distances over a mechanical bandwidth
                 ranging from DC to 30 kHz. The measurement technique
                 involves monitoring optical intensity variations of the
                 interferometric cavity formed by two air-bearing
                 surfaces. This intensity varies between a minimum at
                 zero separation and a maximum at a distance equal to
                 one-quarter of the optical wavelength. For air-bearing
                 distances less than 1 $\mu$ m, a convenient source is
                 the 3.391 $\mu$ m infrared line of the helium-neon
                 laser. By continually monitoring a fraction of the
                 intensity of the optical source, a real-time analog
                 division can be performed on the spacing signals to
                 produce an output independent of laser intensity
                 variations. Room-temperature indium arsenide detectors
                 were selected for their high responsivity and rapid
                 rise time.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A0760L
                 (Optical interferometry); B7320C (Spatial variables
                 measurement); C5320 (Digital storage)",
  classification = "601",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air bearing separation; air bearings; bearings;
                 characteristics; design; devices; distance measurement;
                 He-Ne laser; infrared laser interferometer;
                 interferometers; interferometric cavity; laser beam
                 applications; light; machine bearings; magnetic
                 storage; magnetic storage devices; measurement;
                 mechanical bandwidth; optical intensity variations;
                 spacing signals; thickness measurement",
  treatment =    "A Application",
}

@Article{Tseng:1974:TBL,
  author =       "R. C. Tseng and F. E. Talke",
  title =        "Transition from Boundary Lubrication to Hydrodynamic
                 Lubrication of Slider Bearings",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "534--540",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The transition from boundary lubrication to fully
                 hydrodynamic lubrication is investigated for
                 air-lubricated slider bearings using the electrical
                 resistance method. Intermittent contacts are shown to
                 exist even under conditions for which the numerical
                 solution of the Reynolds equation or white light
                 interferometry predicts steady state spacings in the
                 spacing region from 0.125 to 0.25 $\mu$ m. The
                 transition is similar to the one found in the presence
                 of liquid films, being influenced for a given surface
                 roughness of disk and slider by load, speed, and
                 hydrodynamic design.",
  acknowledgement = ack-nhfb,
  classcodes =   "B7310J (Impedance and admittance measurement); B7320Z
                 (Other nonelectric variables measurement); C5320
                 (Digital storage)",
  classification = "601",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air lubricated slider bearings; bearings; boundary;
                 boundary layers; devices; electrical resistance method;
                 hydrodynamic design; hydrodynamic lubrication;
                 hydrodynamics; liquid films; load; lubrication;
                 machine; magnetic disc and drum storage; magnetic disc
                 file; magnetic storage; resistance measurement;
                 roughness; speed; steady state spacings; surface;
                 transition",
  treatment =    "X Experimental",
}

@Article{Bajorek:1974:HMT,
  author =       "C. H. Bajorek and C. Coker and L. T. Romankiw and D.
                 A. Thompson",
  title =        "Hand-Held Magnetoresistive Transducer",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "541--546",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The initial design of a vertical magnetoresistive head
                 in a hand-held wand for reading magnetically encoded
                 price tags and credit cards is discussed. The
                 performance of the head (e.g., resolution, signal shape
                 and amplitude, and signal-to-noise ratio) is
                 analytically and experimentally evaluated as a function
                 of the configuration of the sensor, head-to-medium
                 interface, and sensor processing and materials.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120N (Magnetic thin
                 film devices); C5320E (Storage on stationary magnetic
                 media); C5320 (Digital storage)",
  classification = "714; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amplitude; data processing, business --- Data
                 Acquisition; handheld wand; magnetic devices, thin
                 film; magnetic heads; magnetic thin film devices;
                 magnetically encoded credit cards; magnetically encoded
                 price tags; magnetoresistance; magnetoresistive
                 transducers; resolution; S/N ratio; sensor processing;
                 signal; signal shape; transducers; vertical
                 magnetoresistive head",
  treatment =    "A Application",
}

@Article{Hempstead:1974:TIP,
  author =       "R. D. Hempstead",
  title =        "Thermally Induced Pulses in Magnetoresistive Heads",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "547--550",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The thermal response of a magnetoresistive head is
                 analyzed for frictional heating between the head
                 surface and dust particles or other asperities on the
                 recording medium surface during relative motion of the
                 head and medium. A theoretical model is presented
                 showing that pulses are induced in the output of a
                 magnetoresistive head as a result of this frictional
                 heating. The model predicts the dependence of these
                 thermal noise spikes on the thermal properties of the
                 substrate and cover chip for the magnetoresistive head,
                 the dimensions of the magnetoresistive stripe, the
                 head-medium relative velocity, and the rate of
                 frictional heat generation. Experimental verification
                 of the theoretical model is obtained by scanning a
                 focused laser beam across a head.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120N (Magnetic thin
                 film devices); C5320C (Storage on moving magnetic
                 media)",
  classification = "714; 723",
  corpsource =   "IBM Thomas J. Watson, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "asperities; beam; data processing, business --- Data
                 Acquisition; devices; focused laser; friction;
                 frictional heating; heating; magnetic devices, thin
                 film; magnetic heads; magnetic thin film;
                 magnetoresistance; magnetoresistive head;
                 magnetoresistive stripe; modelling; relative velocity;
                 theoretical model; thermal noise; thermal noise
                 spikes:; thermal response; thin film transducer",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Cole:1974:NAS,
  author =       "R. W. Cole and R. I. Potter and C. C. Lin and K. L.
                 Deckert and E. P. Valstyn",
  title =        "Numerical Analysis of the Shielded Magnetoresistive
                 Head",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "551--555",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Numerical computations for the shielded
                 magnetoresistive head are reported and compared with
                 previous analytic and experimental results. Linear
                 resolution is found to be essentially the same as for
                 inductive heads. Output amplitude is in the range 50 to
                 175 V per meter track width for a sense current density
                 of 5 multiplied by 10**1**0 A/m**2.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120N (Magnetic thin
                 film devices); C5320C (Storage on moving magnetic
                 media)",
  classification = "714; 723",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; current density; data processing, business
                 --- Data Acquisition; linear resolution; magnetic
                 devices, thin film; magnetic heads; magnetic shielding;
                 magnetic thin film devices; magnetoresistance;
                 numerical; numerical analysis; output amplitude; sense
                 current density; shielded magnetoresistive head",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Comstock:1974:FFR,
  author =       "R. L. Comstock and E. B. Moore",
  title =        "Ferrite Film Recording Surfaces for Disk Recording",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "556--562",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Ferrite thin films have been prepared using a chemical
                 deposition process: hematite and substituted hematite
                 films were formed by spin coating a diluted solution of
                 the metal nitrates on a substrate and subsequently
                 heating the substrate in air to 300C to crystallize the
                 film. Magnetic ferrite films were formed by reducing
                 the films in a wet hydrogen atmosphere. Process
                 parameters, which have evolved from studies on spin
                 coating and reduction on 7.62- and 35.56-cm substrates,
                 have been determined that result in desirable magnetic
                 properties. Experimental studies of film composition
                 and morphology are reported. It has been determined
                 both theoretically and experimentally that film
                 thickness near 0.125 $\mu$ m is optimum for
                 high-density recording with heads with gap lengths of
                 approximately 1 $\mu$ m spaced about 0.5 $\mu$ m from
                 the film. A TiO$_2$ undercoat (0.125 $\mu$ m) on the
                 Al-Mg alloy substrate was prepared by chemical vapor
                 deposition and resulted in improved magnetic
                 properties. Magnetic properties of the films and
                 magnetic recording performance of disks using Ti and Al
                 substrates with the TiO$_2$ undercoat are reported.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120N (Magnetic thin
                 film devices); B3120 (Magnetic material applications
                 and devices); C5320C (Storage on moving magnetic
                 media)",
  classification = "708; 721; 722",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al-Mg alloy substrate; coating techniques; data
                 storage, digital --- Ferrite Applications; data
                 storage, magnetic; drum storage; ferrite applications;
                 ferrite thin; ferrites --- Thin Films; film; film
                 composition; films; haematite films; magnetic disc and;
                 magnetic disc recording; magnetic recording; magnetic
                 thin films; morphology; performance; spin coating;
                 thickness; TiO/sub 2/ undercoat",
  treatment =    "A Application",
}

@Article{Bate:1974:RSR,
  author =       "G. Bate and L. P. Dunn",
  title =        "The remanent state of recorded tapes",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "563--569",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements are reported on the in-plane and the
                 perpendicular components of the remanence a tape
                 acquires on passing through the steady field of a
                 recording head. The tape coating were oriented and
                 unoriented particles of gamma -Fe$_2$O$_3$, oriented
                 CrO$_2$ and unoriented Co-substituted gamma
                 -Fe$_2$O$_3$. The two writing heads used had 10 $\mu$
                 m-and 2.25 $\mu$ m-gaps, respectively. In each case the
                 in-plane magnetization increases at first with
                 increasing writing current, and eventually reaches a
                 peak that less than the maximum in-plane remanence
                 produced on the same sample by an electromagnet. For
                 higher values of writing current, in-plane
                 magnetization in the tape actually decreases. The
                 perpendicular remanence is not large enough to explain
                 the difference between the in-plane remanence acquired
                 from the head and the remanence acquired in a magnet.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media)",
  classification = "722",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "coatings; data storage, magnetic; inplane
                 magnetisation; magnetic recording; magnetic tape;
                 magnetic tapes; magnetisation; perpendicular
                 magnetization; recorded tapes; recording performance;
                 remanence; tape; writing heads",
  treatment =    "X Experimental",
}

@Article{Su:1974:NDD,
  author =       "J. L. Su and M. L. Williams",
  title =        "Noise in Disk Data-Recording Media",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "570--575",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements were made of recording medium noise in
                 erased disks using an in-contact magnetoresistive
                 element and an inductive head supported on an air
                 bearing slider. Four types of coatings on aluminum
                 disks were examined: thin, transition-metal alloy film,
                 CrO$_2$, FeCo particle, and gamma -Fe$_2$O$_3$. Results
                 obtained by means of three measurement techniques are
                 in qualitative agreement and indicate that: DC-erased
                 noise of alloy film disks is 14 to 20 dB lower than
                 that of particulate disks measured; DC-erased noise of
                 particulate disks measured is 6 to 16 dB above their
                 bulk-erased noise; although DC noise of particulate
                 disks increases with write current, DC noise of alloy
                 film disks is independent of write current; the shapes
                 of the noise spectra are similar in DC-erased
                 particulate gamma -Fe$_2$O$_3$ disks and FeCo particle
                 coated disks; and significant modulation noise is
                 detected on particulate disks but not on alloy film
                 disks. The observed DC-erased noise spectrum is
                 compared with the model for small particle noise and is
                 then used to estimate the size of particle agglomerates
                 or voids.",
  acknowledgement = ack-nhfb,
  classcodes =   "B7310L (Magnetic variables measurement); C5320C
                 (Storage on moving magnetic media)",
  classification = "722",
  corpsource =   "IBM, Monterey, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "agglomerates; air bearing slider; Al discs; alloy film
                 discs; data storage, magnetic; DC erased; in contact
                 magnetoresistive element; inductive head; magnetic disc
                 and drum storage; magnetic recording; measurement;
                 modulation noise; noise; noise spectra; particle size;
                 particulate discs; recording medium; size of particle;
                 write current",
  treatment =    "X Experimental",
}

@Article{Thornley:1974:SSM,
  author =       "R. F. M. Thornley and J. A. Williams",
  title =        "Switching Speeds in Magnetic Tapes",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "576--578",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Comparative measurements are reported on the switching
                 speeds of three different magnetic tape materials, as
                 determined by application of short field pulses of
                 well-defined duration and magnitude. A sensitive
                 measure of the change in magnetization is the length of
                 applied pulse required for the peak readback signal to
                 drop from 60 percent to 40 percent of its peak value.
                 This pulse length was 2.6 ns for a gamma -Fe$_2$O$_3$
                 tape, 4.1 ns for a CrO$_2$ tape, and 1.4 ns for a
                 cobalt-substituted gamma -Fe$_2$O$_3$ tape.",
  acknowledgement = ack-nhfb,
  classcodes =   "B7310L (Magnetic variables measurement); C5320C
                 (Storage on moving magnetic media)",
  classification = "722",
  corpsource =   "IBM, Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "change in magnetization; data storage, magnetic ---
                 Tape; magnetic switching; magnetic tape; magnetic
                 tapes; peak readback signal; pulse length; short field
                 pulses",
  treatment =    "X Experimental",
}

@Article{Patel:1974:ORC,
  author =       "A. M. Patel and S. J. Hong",
  title =        "Optimal Rectangular Code for High Density Magnetic
                 Tapes",
  journal =      j-IBM-JRD,
  volume =       "18",
  number =       "6",
  pages =        "579--588",
  month =        nov,
  year =         "1974",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "IBM's 6250 bpi 3420 tape units require a powerful
                 error-correcting code for the standard 9-track format.
                 The optimal rectangular code (ORC), presented here, is
                 designed to correct any single-track error or, given
                 erasure pointers, any double-track error in the tape.
                 The code achieves this by conforming to a rectangular
                 codeword of which two orthogonal sides are check bits.
                 The code is specially tailored from a general class of
                 b-adjacent codes. The ORC can be implemented without a
                 buffer for encoding and offers a simple
                 error-correction mechanism. The code can be generalized
                 to multiple-channel applications.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C6130 (Data
                 handling techniques)",
  classification = "722",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic --- Tape; error correction
                 code; error correction codes; high density magnetic
                 tapes; magnetic tape; magnetic tapes; optimal;
                 rectangular code",
  treatment =    "P Practical",
}

@Article{Keppel:1975:ACS,
  author =       "E. Keppel",
  title =        "Approximating complex surfaces by triangulation of
                 contour lines",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "2--11",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05C99 (53C45 68A45)",
  MRnumber =     "53 \#210",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0260 (Optimisation techniques); B0290F (Interpolation
                 and function approximation); C1180 (Optimisation
                 techniques); C4130 (Interpolation and function
                 approximation)",
  corpsource =   "IBM, Heidelberg, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; combinatorial problem; complex surfaces;
                 contour lines; curve fitting; graph theory; human head;
                 optimal approximation; optimisation; radiation therapy
                 planning; triangulation",
  reviewer =     "A. K. Dewdney",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Burge:1975:SPF,
  author =       "W. H. Burge",
  title =        "Stream Processing Functions",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "12--25",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "One principle of structured programming is that a
                 program should be separated into meaningful independent
                 subprograms, which are then combined so that the
                 relation of the parts to the whole can be clearly
                 established. This paper describes several alternative
                 ways to compose programs. The main method used is to
                 permit the programmer to denote by an expression the
                 sequence of values taken on by a variable. The sequence
                 is represented by a function called a stream, which is
                 a functional analog of a coroutine. The conventional
                 while and for loops of structured programming may be
                 composed by a technique of stream processing (analogous
                 to list processing), which results in more structured
                 programs than the originals. This technique makes it
                 possible to structure a program in a natural way into
                 its logically separate parts, which can then be
                 considered independently.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; coroutine; functional analogue;
                 independent subprograms; programming; stream processing
                 functions; structured programming",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lomet:1975:SIR,
  author =       "D. B. Lomet",
  title =        "Scheme for Invalidating References to Freed Storage",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "26--35",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A storage management scheme is described that supports
                 the invalidation of addresses to freed storage and
                 thus, in that sense, provides a secure system. Unlike
                 previous virtual memory techniques, the allocated areas
                 of the scheme can vary from the very large, requiring
                 multiple pages of storage, to the very small, in which
                 several can be contained on a single page. Special
                 treatment is accorded procedure activation storage so
                 as to provide increased effectiveness for this
                 important case. The interaction of this deletion scheme
                 with garbage collection techniques is also examined.
                 Finally, the relative advantages of retention and
                 deletion strategies of storage management are
                 considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "addresses; computer systems programming; deletion
                 scheme; freed storage reference invalidation; garbage
                 collection techniques; retention; scheme; secure
                 system; storage management; virtual memory techniques;
                 virtual storage",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chandy:1975:PAQ,
  author =       "K. M. Chandy and U. Herzog and L. Woo",
  title =        "Parametric Analysis of Queueing Networks",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "36--42",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20 (90B10)",
  MRnumber =     "52 \#2755",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A queueing network is considered with M exponential
                 service stations and with N customers. The behavior is
                 studied of a subsystem sigma, which has a single node
                 as input and a single node as output, when the
                 subsystem parameters are varied. An ``equivalent''
                 network is constructed in which all queues except those
                 in subsystem sigma are replaced by a single composite
                 queue. It is shown that for certain classes of system
                 parameters, the behavior of subsystem sigma in the
                 equivalent network is the same as in the given network.
                 The analogy to Norton's theorem in electrical circuit
                 theory is demonstrated. In addition, the equivalent
                 network analysis can be applied to open exponential
                 networks.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B1130 (General circuit
                 analysis and synthesis methods); C1140C (Queueing
                 theory)",
  classification = "713; 922",
  corpsource =   "Univ. Texas, Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analogies; customers; electrical circuit theory;
                 equivalent circuits; equivalent network analysis;
                 exponential service stations; network analysis; node;
                 Norton's theorem; open exponential networks; parametric
                 analysis; probability; queueing networks; queueing
                 theory; single; single composite queue; subsystem",
  reviewer =     "T. N. Bhargava",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Parametric analysis of queuing networks",
}

@Article{Chandy:1975:AAG,
  author =       "K. M. Chandy and U. Herzog and L. Woo",
  title =        "Approximate Analysis of General Queueing Networks",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "43--49",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20 (90B10)",
  MRnumber =     "52 \#2756",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An approximate iterative technique for the analysis of
                 complex queueing networks with general service times is
                 presented. The technique is based on an application of
                 Norton's theorem from electrical circuit theory to
                 queueing networks which obey local balance. The
                 technique determines approximations of the queue length
                 and waiting time distributions for each queue in the
                 network. Comparison of results obtained by the
                 approximate method with simulated and exact results
                 shows that the approximate method has reasonable
                 accuracy.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B0290F (Interpolation and
                 function approximation); B1130 (General circuit
                 analysis and synthesis methods); C1140C (Queueing
                 theory); C4130 (Interpolation and function
                 approximation)",
  classification = "922",
  corpsource =   "Univ. Texas, Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approximate; approximate analysis; complex queueing
                 networks; electrical circuit theory; function
                 approximation; general; iterative methods; iterative
                 technique; local balance; network analysis; Norton's
                 theorem; probability; queue length; queueing theory;
                 service times; waiting time distributions",
  reviewer =     "T. N. Bhargava",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Approximate analysis of general queuing networks",
}

@Article{Rideout:1975:DDC,
  author =       "V. L. Rideout and F. H. Gaensslen and A. LeBlanc",
  title =        "Device Design Considerations for Ion Implanted
                 $n$-Channel {MOSFET}s",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "50--59",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Considerations are presented for ion implanted,
                 n-channel, polysilicon gate, enhancement-mode MOSFETs
                 for dynamic switching applications. A shallow channel
                 implant is used to raise the magnitude of the gate
                 threshold voltage while also maintaining a low
                 substrate sensitivity. Design trade-offs between
                 channel implantation energy and dose and substrate bias
                 were examined using both computer analyses and
                 experimental devices. The design objective was to
                 identify the combination of these three parameter
                 values that gives both a low substrate sensitivity and
                 a steep subthreshold conduction characteristic under
                 the conditions of a gate threshold voltage of 1 v and a
                 substrate bias range of 0 to minus 1 v. One-dimensional
                 and two-dimensional computer analyses were performed to
                 predict the effect of the device parameters on the
                 electrical characteristics. MOSFETs were then
                 fabricated to investigate the extremes of the design
                 parameter range, and the experimental and predicted
                 device characteristics were compared.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0510 (Crystal growth); B2550B (Semiconductor doping);
                 B2550 (Semiconductor device technology); B2560S (Other
                 field effect devices)",
  classification = "713; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analyses; channel; computer; design considerations;
                 dose; dynamic; enhancement mode; field effect
                 transistors; implantation energy; integrated circuits,
                 digital; ion implantation; MOSFETs; n-channel;
                 polysilicon gate; shallow channel implant; steep
                 subthreshold conduction characteristic; substrate bias;
                 substrate sensitivity; switching applications;
                 transistors, field effect",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Yhap:1975:KMC,
  author =       "E. F. Yhap",
  title =        "Keyboard Method for Composing {Chinese} Characters",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "60--70",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A keyboard method is described that allows a user to
                 form Chinese characters. The user's keystrokes activate
                 internal logic, which performs the necessary scaling
                 and positioning of the character components. An initial
                 design using a 40-key keyboard is described, together
                 with approximations of the character shapes produced by
                 given keying sequences. Rough estimates of speed range
                 from eight to 33 characters per minute.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5540 (Terminals and graphic displays)",
  classification = "745",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "40 key keyboard; character sets; character shapes;
                 composing Chinese characters; internal; keyboards;
                 logic; typewriters",
  treatment =    "P Practical",
}

@Article{Wang:1975:SSL,
  author =       "C. P. Wang and H. H. Wedekind",
  title =        "Segment Synthesis in Logical Data Base Design",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "71--77",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A15 (68A30)",
  MRnumber =     "50 \#16115",
  bibdate =      "Sat Feb 24 09:26:54 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See comments
                 \cite{Bernstein:1976:CSS,Wiederhold:1976:COS}.",
  abstract =     "Identification and representation of entities and
                 their relationships relevant to an application are some
                 of the key problems in logical data base design. This
                 paper presents an approach to synthesizing logical
                 segments that are representations of such entities and
                 relationships. The major steps in this design are (1)
                 collect all the pertinent functional relations in the
                 application domain; (2) remove redundant relations to
                 obtain a minimal covering set; (3) minimize the number
                 of relations in the covering set to obtain an optimal
                 set of relations in the third normal form; and (4)
                 combine relations into logical segments according to
                 prescribed performance requirements and projected
                 information maintenance activities. Synthesis of
                 logical segments for an airline reservations
                 applications is used as an illustrative example.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C7100 (Business and
                 administration)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "activities; airline reservations application; data
                 processing; entities; file organisation;
                 identification; information maintenance; logical data
                 base design; management information systems; minimal
                 covering; optimal set of relations; relationships;
                 representation; segment synthesis; set",
  reviewer =     "W. W. Armstrong",
  treatment =    "P Practical",
}

@Article{Gay:1975:CPQ,
  author =       "T. W. Gay and P. H. Seaman",
  title =        "Composite Priority Queue",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "1",
  pages =        "78--81",
  month =        jan,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "50 \#15477",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Formulas are given for calculating waiting time for
                 customers in a queue with combined preemptive and
                 head-of-line (nonpreemptive) priority scheduling
                 disciplines and describes the reasoning behind them.
                 This work has been applied in the development of
                 programmable terminal control units.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory)",
  classification = "922",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "composite priority queue; control units; head of line;
                 priority scheduling disciplines; probability;
                 programmable terminal; queueing theory; waiting time",
  reviewer =     "Izhak Rubin",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fleisher:1975:IAL,
  author =       "H. Fleisher and L. I. Maissel",
  title =        "An introduction to array logic",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "98--109",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "After a discussion of the reasons for choosing to
                 implement logic in array form, a detailed description
                 of the nature of array logic is given. Topics
                 specifically discussed include general array structures
                 and implementation, influence of decoder partitioning,
                 design of logic arrays, output phase, ``split''
                 variables, feedback in logic arrays, and
                 reconfiguration.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5120 (Logic and switching circuits); C5210 (Logic
                 design methods)",
  classification = "721; 723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array chips; array decoder; array logic; array
                 structures; bit; combinatorial logic; computer systems
                 programming --- Table Lookup; decoder partitioning;
                 feedback; implement logic; logic circuits; logic
                 design; output phase; reconfiguration; storing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Logue:1975:HIS,
  author =       "J. C. Logue and N. F. Brickman and F. Howley and J. W.
                 Jones and W. W. Wu",
  title =        "Hardware Implementation of a Small System in
                 Programmable Logic Arrays",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "110--119",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Programmable Logic Arrays, PLAs, exploit many of the
                 benefits of LSI but without the high engineering design
                 costs. This paper describes an experiment in the design
                 and implementation of a small complex system in array
                 logic. The IBM 7441 Buffered Terminal Control Unit was
                 selected for this comparison because it is a small but
                 complex terminal controller implemented in dual in-line
                 packaged transistor logic, DIP-TL, with small to medium
                 scale integration.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5120 (Logic and switching circuits); C5210 (Logic
                 design methods); C5220 (Computer architecture)",
  classification = "721; 722; 723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array oriented; array oriented structure; arrays;
                 computer architecture; computer architecture ---
                 Microprogramming; digital circuits; language; large;
                 logic arrays; logic circuits; logic design; LSI; macro
                 capability; master chip; PLA; programmable logic; scale
                 integration; transistor logic",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Jones:1975:ALM,
  author =       "J. W. Jones",
  title =        "Array Logic Macros",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "120--126",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A macro design approach is discussed which combines
                 the cost-effective attributes of array logic structures
                 with those of random logic. These macros utilize the
                 following features: (a) internal feedback registers for
                 performing sequential logic, (b) masking and submasking
                 to reduce the number of words in the array for certain
                 functions, (c) control of the array's output level to
                 vary the apparent size of the array, (d) decoding on
                 input pairs and\slash or EXCLUSIVE ORing on output
                 pairs for increasing the number of logic levels, and
                 (e) random-access memory in the feedback and its use in
                 interrupt handling. The macros are explained by
                 specific design examples. This paper also discusses
                 standard logic circuits in combination with an array
                 structure to produce a component that can be used
                 efficiently in specific data processing areas.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5120 (Logic and switching circuits); C5210 (Logic
                 design methods)",
  classification = "721",
  corpsource =   "IBM, Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access memory; array logic; array logic macros; array
                 logic structures; combinational logic; decoding;
                 feedback register; feedback registers; finite state
                 switching; internal; logic circuits; logic design;
                 macros; random; random access memory; random logic;
                 sequential logic",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Kasprzak:1975:PDP,
  author =       "L. Kasprzak and A. Hornung",
  title =        "Polarization and Depolarization in {PSG} Films",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "127--132",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Thin phosphosilicate glass (PSG) films are used
                 extensively throughout the semiconductor industry as
                 Na** plus ion barriers. The major disadvantage in using
                 PSG films in field effect transistor (FET) devices for
                 threshold voltage stabilization is that these films
                 polarize and therefore contribute to the shift in
                 threshold voltage. The demand for increased performance
                 of integrated circuits and for special applications
                 requiring precise threshold voltage control have made
                 it imperative to reexamine some aspects of PSG
                 polarization in more detail. A physical model has been
                 postulated to explain the observed effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340Q (Metal-insulator-semiconductor structures);
                 A7360H (Electronic properties of insulating thin
                 films); A7730 (Dielectric polarization and
                 depolarization effects); B2530F
                 (Metal-insulator-semiconductor structures); B2810
                 (Dielectric materials and properties)",
  classification = "713; 714; 812",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "decay; depolarization; dielectric polarisation; FET
                 devices; glass; insulating thin films;
                 insulator-semiconductor devices; integrated circuits;
                 mechanism; metal-; phosphosilicate glass films;
                 polarization; PSG; semiconductor devices, field effect;
                 temperature dependence; temperature dependent
                 polarisation; threshold; transistors, field effect;
                 voltage shift",
  treatment =    "A Application; X Experimental",
}

@Article{MacDonald:1975:SHO,
  author =       "J. E. MacDonald and K. L. Sigworth",
  title =        "Storage Hierarchy Optimization Procedure",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "133--140",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents optimization techniques for a
                 storage hierarchy subject to quantity-sensitive
                 component costs. It is assumed that a finite (and
                 probably small) set of technologies is available. Each
                 technology is characterized by an access time and two
                 cost parameters. Solutions to four problems of
                 increasing complexity are presented: (1) minimization
                 of access time for a fixed cost and preassigned page
                 sizes; (2) optimization of a generalized
                 price-performance function under preassigned page
                 sizes; (3) minimization of access time for a fixed cost
                 when page sizes are allowed to vary; (4) optimization
                 of a generalized price-performance function when page
                 sizes are allowed to vary.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5310 (Storage system design); C6120 (File
                 organisation)",
  classification = "722; 723",
  corpsource =   "IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access time; address; component costs; computer
                 operating systems --- Storage Allocation; cost
                 parameters; data storage, digital; file organisation;
                 Lagrange multipliers; memory hierarchy, Performance
                 Evaluation: Analytic; optimization; procedure;
                 statistics; storage hierarchies; storage hierarchy;
                 storage technologies; storage units",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ling:1975:BIC,
  author =       "H. Ling and F. P. Palermo",
  title =        "Block-Oriented Information Compression",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "141--145",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new scheme is presented for information compression
                 that does not use information statistics. Each
                 information block is represented by two sub-blocks
                 called the alphabet and the generator. The alphabet
                 contains the linearly independent elements; the
                 generator is computed through the linear combination of
                 the linearly dependent elements. The total length of
                 these two sub-blocks is generally shorter (never
                 greater) than the original block.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6110 (Information theory); C1260 (Information
                 theory); C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "IBM, White Plains, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binary; binary number compression; CPUs; data base;
                 data bases; data compression; data processing;
                 information block; information compression; information
                 statistics; information theory; information theory ---
                 Data Compression; number reconstruction; one pass
                 algorithm; statistical analysis; statistics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Magdo:1975:HST,
  author =       "S. Magdo and I. Magdo",
  title =        "High Speed Transistor with Double Base Diffusion",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "146--150",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A high speed bipolar transistor has been fabricated by
                 using double base diffusion to reduce the base
                 resistance $R_B$. The base resistance forms two
                 important time constants, $R_{BCD}$ and $R_B
                 C_C(R_L/R_E)$ with the emitter diffusion capacitance
                 $C_D$ and collector capacitance $C_C$ dominating the
                 switching delay of the circuits. It is demonstrated
                 that the base resistance of a single base diffused
                 device can be reduced by a factor of four by using
                 double base diffusion without affecting its cut-off
                 frequency $f_t$ equals 7 GHz. The double base diffusion
                 also increases the punchthrough voltage of the device
                 from 3 to 7v.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550B (Semiconductor doping); B2560J (Bipolar
                 transistors)",
  classification = "714",
  corpsource =   "IBM, East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "base resistance; bipolar transistors; breakdown;
                 collector capacitance; cut off frequency; double base
                 diffusion; emitter diffusion capacitance; high speed
                 transistor; impurity concentration; integrated
                 circuits; punchthrough voltage; semiconductor;
                 semiconductor doping; switches; switching delay;
                 transistors, bipolar; voltage",
  treatment =    "A Application; X Experimental",
}

@Article{Mader:1975:DGP,
  author =       "S. Mader and A. E. Blakeslee",
  title =        "On Dislocations in {GaAs$_{1-x}$P$_x$}",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "151--162",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Misfit dislocations in epitaxially grown layers of
                 GaAs$_{1-x}$P$_x$ with a lattice constant gradient are
                 examined by transmission electron microscopy. In
                 specimens with (113) A growth planes, they form a
                 three-dimensional arrangement of glissile and sessile
                 dislocations. Cross slip is an important process in the
                 generation of the dislocations. High resolution
                 microscopy shows (1) glissile dislocations dissociated
                 into partial dislocations and (2) undissociated sessile
                 Lomer dislocations. These differences are attributed to
                 contributions to the dislocation core energy from wrong
                 bonds and dangling bonds.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170 (Defects in crystals); A6855 (Thin film growth,
                 structure, and epitaxy); A8115 (Methods of thin film
                 deposition); B0510D (Epitaxial growth); B2550
                 (Semiconductor device technology)",
  classification = "531; 712; 714; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cross slip; dislocations; dissociated dislocations;
                 electron microscope examination of materials; epitaxial
                 growth; epitaxially grown layers; GaAs/sub 1-x/P/sub;
                 gallium arsenide; glissile dislocations; III-V
                 semiconductors; Lomer dislocations; misfit; partial
                 dislocations; screw dislocations; semiconducting
                 gallium compounds; semiconductor diodes, light
                 emitting; sessile dislocations; transmission electron
                 microscopy; undissociated dislocations; x/",
  treatment =    "A Application; X Experimental",
}

@Article{Rosenberg:1975:WMA,
  author =       "A. L. Rosenberg and J. W. Thatcher",
  title =        "What is a Multilevel Array?",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "163--169",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "51 \#14627",
  bibdate =      "Mon Feb 12 08:06:14 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In intuitive terms, a multilevel array is either a
                 scalar or an array each of whose elements is a
                 multilevel array. The ``semantics'' of multilevel
                 arrays can be easily expressed in terms of a notion of
                 selector, which is basically that of the Vienna
                 Definition Language. These selectors provide both a
                 notational device for accessing multilevel arrays and a
                 clean mathematical definition of ``multilevel array
                 with data domain D.'' However, the definition so
                 obtained lacks the recursive flavor of the intuitive
                 definition. By means of an axiomatic characterization
                 of multilevel arrays, the selector-based definition and
                 the recursive definition are shown to be equivalent.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array access; data processing; data structures;
                 generalized arrays; multilevel; multilevel array;
                 multilevel arrays; subarrays",
  reviewer =     "W. D. Maurer",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lukes:1975:CSP,
  author =       "J. A. Lukes",
  title =        "Combinatorial Solution to the Partitioning of General
                 Graphs",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "170--180",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "05C99",
  MRnumber =     "51 \#12619",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reviews a dynamic programming procedure for
                 the partitioning of connected graphs with
                 integer-weighted nodes and positive valued edges. The
                 upper bound on the number of feasible partitions
                 generated using this technique is shown to grow
                 factorially in the number of graph nodes. The use of
                 graph properties is then introduced to reduce the
                 number of feasible partitions generated in the
                 determination of the optimal partition. Depending upon
                 the structure of the graph, the use of these properties
                 can cause a significant reduction in the computation
                 time and storage space required to partition the
                 graph.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); B0260 (Optimisation
                 techniques); C1160 (Combinatorial mathematics); C1180
                 (Optimisation techniques)",
  classification = "921",
  corpsource =   "IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "combinatorial solution; computation time; connected
                 graphs; cutpoints; dynamic programming; graph theory;
                 graphs; isolated set; mathematical techniques; optimal
                 partitioning; partitioning algorithm; partitioning of
                 general; storage space",
  reviewer =     "Karel Culik",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Urschler:1975:ASP,
  author =       "G. Urschler",
  title =        "Automatic Structuring of Programs",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "2",
  pages =        "181--194",
  month =        mar,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "52 \#4695",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method is described that allows the translation of a
                 traditionally written (unstructured) program into a set
                 of top-down structured, semantically founded, GOTO-free
                 modules. The method reveals not only the logic of a
                 given program in a most natural way, but it also
                 reduces code duplication to a minimum. It is further
                 shown how the obtained structured program can be mapped
                 back into a GOTO program in such a way that all GOTOS
                 are backwards branches and their number is minimal. The
                 connection between recursively and iteratively
                 structured programs is demonstrated using the WHILE, DO
                 FOREVER, and multilevel EXIT statements. Extensions of
                 the method show the structuring of source programs
                 containing block structures and subroutines.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6110
                 (Systems analysis and programming)",
  classification = "721; 723",
  corpsource =   "IBM, Vienna, Austria",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automata theory; automatic structuring; computer
                 programming; GOTO free modules; GOTO program; modular
                 programs; modules; program; program logic; programming
                 theory; recursive language; structured program; top
                 down structured; unstructured",
  reviewer =     "K. H. V. Booth",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bard:1975:APS,
  author =       "Y. Bard",
  title =        "Application of the {Page Survival Index} ({PSI}) to
                 Virtual-Memory System Performance",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "212--220",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Page Survival Index (PSI) was defined in a
                 preceding paper where it was used to describe the
                 behavior of individual programs running in a time
                 sharing environment. It is shown how a system-wide
                 value of PSI can be calculated on the fly by the
                 operating system. This value can be used to estimate
                 users' memory requirements and to control system
                 performance by maintaining the proper multiprogramming
                 level. Simulation results show that a scheduler based
                 on these concepts can achieve significant improvements
                 in system performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Data Processing Div., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming --- Multiprogramming;
                 computers; multiprogrammed virtual storage computer
                 system; multiprogramming; page; scheduling; survival
                 index; virtual storage",
  treatment =    "P Practical",
}

@Article{Bryant:1975:PWS,
  author =       "Peter Bryant",
  title =        "Predicting Working Set Sizes",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "221--229",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Empirical analyses of data on working set size are
                 reported. The data do not support the hypothesis that
                 working set sizes are normally distributed. The data
                 suggest various algorithms for predicting working set
                 size based on the program's past history. Several
                 representative algorithms are discussed and
                 evaluated.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Data Processing Div., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers; operating systems; operating systems
                 (computers); predicting working set size; program's
                 working set; scheduling",
  treatment =    "X Experimental",
}

@Article{Freiberger:1975:PPR,
  author =       "W. F. Freiberger and U. Grenander and P. D. Sampson",
  title =        "Patterns in Program References",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "230--243",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "52 \#9661",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Papers on system performance evaluation.",
  abstract =     "This paper describes a study of some of the
                 characteristics of program referencing patterns.
                 Program behavior is investigated by constructing
                 stochastic models for the page reference mechanism and
                 evaluating the validity of the assumptions made through
                 comparison with empirical results. The notion of a
                 regime process is shown to play a useful role in
                 describing the observed phenomena mathematically. The
                 study falls within the realm of a rapidly growing field
                 of computer science known as compumetrics, where
                 quantitative and qualitative methods are being applied
                 to the study and evaluation of computer performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "Div. of Appl. Math., Brown Univ., Providence, RI,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compumetrics; computers; evaluation of computer;
                 modelling; multiprogramming; operating systems; page;
                 performance; program referencing patterns; reference
                 mechanism; stochastic models; virtual storage",
  reviewer =     "K. Vairavan",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Ferrari:1975:TPM,
  author =       "Domenico Ferrari",
  title =        "Tailoring Programs to Models of Program Behavior",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "244--251",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper considers the premise that, in addition to
                 trying to solve the virtual-memory-system performance
                 problem by devising a storage management strategy
                 suitable for the broad spectrum of behavior exhibited
                 by programs, efforts also be made to tailor the
                 behavior of each program to the model underlying the
                 storage management strategy under which the program
                 will have to run. It is observed that a viable approach
                 to program tailoring is offered by restructuring
                 techniques. The application of dynamic off-line
                 techniques to the tailoring problem is discussed, and
                 an algorithm which may be used to fit program behavior
                 to the working set model is described in detail as an
                 example. The performance of this algorithm in dealing
                 with two real-program traces is experimentally
                 evaluated under a variety of conditions and found to be
                 always satisfactory.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "Computer Sci. Div., Dept. of Electrical Engng., Univ.
                 of California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; dynamic off line
                 technique; management strategy; model of; program
                 behaviour; program tailoring; restructuring techniques;
                 virtual storage",
  treatment =    "A Application; P Practical",
}

@Article{Schatzoff:1975:DES,
  author =       "M. Schatzoff and C. C. Tillman",
  title =        "Design of Experiments in Simulator Validation",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "252--262",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is described, by example, how techniques of
                 statistical design and analysis of experiments have
                 been used to validate the modeling of the dispatching
                 algorithm of a time sharing system. The examples are
                 based on a detailed, trace-drive simulator of CP-67.
                 They show that identical factorial experiments
                 involving parameters of this algorithm, when carried
                 out on both the simulator and on the actual system,
                 produced statistically comparable effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems); C7430 (Computer
                 engineering)",
  classification = "723",
  corpsource =   "IBM Data Processing Div., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming --- Time Sharing
                 Programs; computers; dispatching algorithm modelling;
                 simulation; simulator validation; statistical design
                 and analysis; time sharing system; time-sharing
                 programs",
  treatment =    "P Practical; X Experimental",
}

@Article{Chiu:1975:PAM,
  author =       "W. Chiu and D. Dumont and R. Wood",
  title =        "Performance Analysis of a Multiprogrammed Computer
                 System",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "263--271",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A combination of analytical modeling and measurement
                 is employed for the performance analysis of a
                 multiprogrammed computer system. First, a cyclic queue
                 model is developed for the system under study. Then,
                 model validation is attempted in both controlled and
                 normal environments. The success of the model is
                 demonstrated by its prediction of performance
                 improvements from system reconfigurations. Reasonable
                 correlation between the measured performance and the
                 model predictions under various degrees of
                 multiprogramming is observed. Finally, possible system
                 reconfigurations are explored with the insight gained
                 from the performance analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5400 (Analogue and digital computers and systems);
                 C6150G (Diagnostic, testing, debugging and evaluating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytical modelling; computer selection and
                 evaluation; computer system; computer systems
                 programming --- Multiprogramming; computers; cyclic
                 queue model; modelling; multiprocessing systems;
                 multiprogrammed; performance analysis; performance
                 improvements; prediction of",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Chang:1975:TRT,
  author =       "J. H. Chang",
  title =        "Terminal Response Times in Data Communications
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "272--282",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A response time analysis for a general class of
                 terminals-to-computer subsystem is presented. The model
                 used is based on the most advanced data communications
                 system in which terminals are connected to Terminal
                 Control Units (TCU) that are in turn connected to local
                 Front-End Processors (FEP). The line control procedures
                 used to interface a TCU and an FEP may be half-duplex
                 Binary Synchronous Communications (BSC), half-duplex
                 Synchronous Data Link Control (SDLC), or full-duplex
                 SDLC. The models presented can be used to determine
                 bottlenecks in the entire system and to facilitate the
                 initial phase of system design and configuration.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  classification = "723",
  corpsource =   "IBM Corporate Headquarters, Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers; data communication systems; front end; half
                 duplex binary synchronous communication; half or full
                 duplex synchronous data link control; line control
                 procedures; processors; remote consoles; terminal
                 control unit; terminal response time analysis",
  treatment =    "A Application; P Practical",
}

@Article{Reiser:1975:QNM,
  author =       "M. Reiser and H. Kobayashi",
  title =        "Queuing Networks with Multiple Closed Chains: Theory
                 and Computational Algorithms",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "283--294",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30",
  MRnumber =     "52 \#4464",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Papers on system performance evaluation.",
  abstract =     "A recent result of E. Baskett, K. M. Chandy, R. R.
                 Muntz, and F. G. Palacios is generalized to the case in
                 which customer transitions are characterized by more
                 than one closed Markov chain. Generating functions are
                 used to derive closed-form solutions to stability,
                 normalization constant, and marginal distributions. For
                 such a system with N servers and L chains the solutions
                 are considerably more complicated than those for
                 systems with one subchain only. It is shown how open
                 and closed subchains interact with each other in such
                 systems. Efficient algorithms are then derived from the
                 generating function representation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C4290 (Other computer theory); C5400 (Analogue and
                 digital computers and systems); C6150J (Operating
                 systems)",
  classification = "723; 922",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytically solvable queueing networks; chain; closed
                 Markov; computational algorithms; computer engineering
                 applications of; computer systems programming;
                 computers; distributions; marginal; Markov processes;
                 multiple closed chains; multiprocessing systems;
                 normalization constant; probability --- Queueing
                 Theory; queueing theory; stability",
  reviewer =     "Izhak Rubin",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Herzog:1975:SQP,
  author =       "U. Herzog and L. Woo and K. M. Chandy",
  title =        "Solution of Queueing Problems by a Recursive
                 Technique",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "295--300",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25",
  MRnumber =     "52 \#1926",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Papers on system performance evaluation.",
  abstract =     "A recursive method for efficient computational
                 analysis of a wide class of queueing problems is
                 presented. Interarrival and service times are described
                 by multidimensional Markovian processes while arrival
                 and service rates are allowed to be state dependent.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C4290 (Other computer theory)",
  classification = "922",
  corpsource =   "Univ. of Stuttgart, Stuttgart, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arrival and service; efficient computational analysis;
                 interarrival and; Markov processes; multidimensional
                 Markov processes; probability; queueing theory; rates;
                 recursive functions; recursive method; service times",
  reviewer =     "Izhak Rubin",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Sauer:1975:AAC,
  author =       "C. H. Sauer and K. M. Chandy",
  title =        "Approximate Analysis of Central Server Models",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "301--313",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Service time distributions at computer processing
                 units are often nonexponential. Empirical studies show
                 that different programs may have markedly different
                 processing time requirements. When queueing disciplines
                 are first come, first served, preemptive priority or
                 nonpreemptive priority, models reflecting these
                 characteristics are difficult to analyze exactly.
                 Available approximate techniques are often too
                 expensive for parametric analysis. Inexpensive
                 approximate techniques for solution of central server
                 models with the above characteristics are presented.
                 The results of these techniques are validated with
                 simulation results.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis of general; central server; computer systems
                 programming; inexpensive approximate technique; model;
                 multiprocessing systems; multiprogrammed computer
                 system; nonexponential service; queueing networks;
                 queueing theory",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Chow:1975:CSM,
  author =       "We Min Chow",
  title =        "Central Server Model for Multiprogrammed Computer
                 Systems with Different Classes of Jobs",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "3",
  pages =        "314--320",
  month =        may,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30 (90B35)",
  MRnumber =     "54 \#8932",
  bibdate =      "Mon Feb 12 08:06:23 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Papers on system performance evaluation.",
  abstract =     "A computer system can usually be interpreted as a
                 closed network with two different types of servers. It
                 is then possible to convert the network into a single
                 server system with state-dependent arrivals. This paper
                 investigates the stationary behavior of a single server
                 queue with different classes of jobs. It is assumed
                 that the input process has state-dependent exponential
                 inter-arrival times and preemptions at the server are
                 not allowed. The exact solution is obtained by finding
                 the relationship between the time average probability
                 distribution and the departure average probability
                 distribution. The latter can be derived, based upon an
                 imbedded Markov Chain.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "average probability distribution; computer system;
                 computer systems programming; computers --- Selection
                 and Evaluation; departure average; Markov processes;
                 multiprocessing programs; multiprogrammed; probability
                 distribution; queueing theory; single server queue with
                 different classes of jobs; time",
  reviewer =     "F. G. Foster",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Berry:1975:VRI,
  author =       "B. S. Berry and W. C. Pritchet",
  title =        "Vibrating Reed Internal Friction Apparatus for Films
                 and Foils",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "334--343",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An apparatus is described which permits for the first
                 time the resolution of anelastic relaxation effects in
                 evaporated metallic thin films and ion-implanted
                 surface layers of silicon. The composite samples
                 consist of the film or layer of interest on a carrier
                 substrate having the form of a thin cantilevered reed.
                 Low external losses and an exceptionally good span of
                 operating frequencies are obtained by integrally
                 bonding the substrate to a supporting pedestal and by
                 using electrostatic drive and detection for the
                 transverse modes of vibration. The internal friction
                 can be measured with relatively simple instrumentation,
                 at pressures below 10** minus **5 torr (1.33 multiplied
                 by 10** minus **3 Pa) and over the temperature range
                 --- 190 degree C to 550 degree C. The apparatus has
                 considerable versatility for work in a number of areas,
                 including the investigation of metallic foils prepared
                 by splat-cooling.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0710 (Mechanical measurement methods and
                 instruments); A4630R (Mechanical measurement methods
                 and techniques for solids); A6240 (Anelasticity,
                 internal friction and mechanical resonances)",
  classification = "539; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "-190 to 550 degrees C; anelastic relaxation effects;
                 anelastic relaxation measurement; anelasticity;
                 apparatus; carrier substrate; composite samples;
                 elasticity; electrostatic drive; films --- Metallic;
                 integrally bonded substrate; internal friction;
                 internal friction apparatus; ion implanted surface
                 layers; low external losses; mechanical variables
                 measurement; metallic foils; metallic thin films; modes
                 of vibration; pressures below 10/sup -5/ torr; range;
                 resonant method; splat cooled foils; thin cantilevered
                 reed; transverse; vibrating reed; wide frequency range;
                 wide temperature",
  treatment =    "G General Review; X Experimental",
}

@Article{Braun:1975:MHM,
  author =       "R. J. Braun",
  title =        "Modular {Hall} Masterslice Transducer",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "344--352",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Hall masterslice transducer combines modern IC
                 (integrated circuit) technology with a modular design
                 concept to provide a flexible multifunction approach to
                 magnetic sensing. Its sensing element, a controllable
                 Hall cell, is integrated with the associated circuitry
                 on a masterslice chip, mounted in a flux concentrator
                 module that forms the basic building block for diverse
                 application packages. The device has several auxiliary
                 control electrodes that allow fixed or externally
                 variable offset voltage control and magnetic field
                 simulation, as well as threshold, hysteresis, and gain
                 adjustments. Integral flux concentrators provide the
                 module with an efficient magnetic flux path and chip
                 cooling. Three application categories --- switches,
                 proximity sensors, and current sensors --- are
                 discussed and various application package designs are
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560F (Bulk effect devices); B2570 (Semiconductor
                 integrated circuits); B7230 (Sensing devices and
                 transducers)C3240D (Electric transducers and sensing
                 devices)",
  classification = "714",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "auxiliary control electrodes; circuits; combined;
                 concentrator module; controllable Hall cell; current;
                 electric sensing devices; flexible; flux; Hall effect
                 transducers; hall effect transducers; Hall masterslice
                 transducer; Hall transducers; IC masterslice;
                 IC/modular transducer; magnetic; modular design;
                 monolithic integrated circuits; multifunction approach;
                 offset; proximity sensors; sensors; switches; voltage
                 control",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Bennett:1975:LSP,
  author =       "B. T. Bennett and V. J. Kruskal",
  title =        "{LRU} stack processing",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "353--357",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "52 \#2303",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Stack processing, and in particular stack processing
                 for the least recently used replacement algorithms, may
                 present computational problems when it is applied to a
                 sequence of page references with many different pages.
                 This paper describes a new technique for
                 least-recently-used (LRU) stack processing that permits
                 efficient processing of these sequences. An analysis of
                 the algorithm and a comparison of its running times
                 with those of the conventional stack processing
                 algorithms are presented. Finally a multipass
                 implementation is discussed, which was found necessary
                 to process trace data from a large data base system.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer programming; data
                 base system; file organisation; large; least recently
                 used; LRU stack processing; multipass implementation;
                 process trace data; processing; replacement algorithms;
                 running; sequence of page references; stack processing;
                 stack processing algorithm; times; trace data",
  reviewer =     "Frank K. Hwang",
  treatment =    "N New Development; T Theoretical or Mathematical",
}

@Article{Hong:1975:CSA,
  author =       "S. J. Hong and D. L. Ostapko",
  title =        "Codes for Self-Clocking, {AC}-Coupled Transmission:
                 Aspects of Synthesis and Analysis",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "358--365",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Nonreturn-to-zero-inverse (NRZI) waveform codes are
                 considered that satisfy a given set of run-length
                 constraints and the upper bound on the accumulated DC
                 charge of the waveform. These constraints enable the
                 codeword to be self-clocking, ac-coupled, and suitable
                 for data processing tape and communication
                 applications. Various aspects of synthesis and analysis
                 of such codes, called (d,k,C) codes, are illustrated by
                 means of several examples. The choice of the initial
                 state of the encoder is shown to influence the length
                 of the data sequence over which the encoder must
                 look-ahead.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6210Z (Other data transmission);
                 C5320C (Storage on moving magnetic media); C5600 (Data
                 communication equipment and techniques)",
  classification = "723",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(d, k, C) codes; AC-coupled transmission; analysis;
                 binary data; binary sequences; codes; codes, symbolic;
                 communication codes; computers; constraints; data
                 transmission; digital communication systems; encoder
                 look ahead; encoding; initial states; magnetic;
                 magnetic recording; magnetic tape storage; NRZI
                 waveform; recording; run length; self clocking codes;
                 synthesis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Patel:1975:ZEM,
  author =       "A. M. Patel",
  title =        "Zero-Modulation Encoding in Magnetic Recording",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "366--378",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A10",
  MRnumber =     "54 \#9841",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with waveform encoding methods in
                 which binary data are mapped into constrained binary
                 sequences for shaping the frequency spectrum of
                 corresponding waveforms. Short and long pulse widths in
                 the waveform are limited by constraints on the minimum
                 and maximum run-lengths of zeros in the coded
                 sequences. These constraints reduce the intersymbol
                 interference in magnetic recording and provide an
                 adequate rate of transition for accurate clocking.
                 Signal power at low frequencies is limited by means of
                 a constraint on a parameter that corresponds to the
                 maximum imbalance in the number of positive and
                 negative pulses of the waveform. This constraint on the
                 maximum accumulated DC charge also eliminates the
                 zero-frequency component. Zero modulation is one such
                 code that is especially suitable for magnetic recording
                 channels. The encoding and decoding algorithm is
                 presented. A one-to-one correspondence between binary
                 data and constrained sequences is established by
                 creating data states that are isomorphic to the charge
                 states having the same growth rate. Sequences with
                 other values of run-length and charge constraint are
                 examined as candidates for other codes with zero DC
                 component.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C5320C (Storage on moving magnetic
                 media)",
  classification = "722",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binary data; binary sequences; charge constraint;
                 constrained binary sequences; data storage, magnetic;
                 DC; encoding; frequency spectrum shaping; intersymbol
                 interference; magnetic; magnetic recording; modulation
                 encoding; pulse; rate of transition for clocking; tape
                 storage; waveform encoding method; widths constraints;
                 zero; zero DC component",
  reviewer =     "A. D. Wyner",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wood:1975:HDP,
  author =       "R. A. Wood",
  title =        "High-Speed Dynamic Programmable Logic Array Chip",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "379--383",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the circuit design of a
                 programmable logic array (PLA) chip using four-phase
                 dynamic circuits, operating at a nominal cycle time of
                 230 nanoseconds. Bootstrap circuit techniques are used
                 to obtain high function and performance by satisfying
                 some special requirements of PLA designs. These include
                 a simple means for two-bit partitioning of the data
                 inputs, a noninverting buffer circuit between
                 precharged arrays, and a fast, compact on-chip driver
                 for heavily loaded arrays. Multiphase clocking enables
                 the use of master\slash slave type JK flip-flops with
                 minimum circuitry and power dissipation. A polarity
                 hold function is provided at the outputs to allow
                 interfacing the dynamic design to static output
                 circuits.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1260 (Pulse circuits); B1265 (Digital electronics);
                 B2560S (Other field effect devices); B2570
                 (Semiconductor integrated circuits); C5120 (Logic and
                 switching circuits)",
  classification = "721",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "230 ns cycle time; bootstrap; buffer circuit; circuit;
                 circuit design; circuits; digital integrated circuits;
                 field effect transistors; four phase dynamic; high
                 speed logic array; hold circuit; JK flipflops; logic;
                 logic devices; monolithic integrated circuits;
                 multiphase clocking; noninverting; programmable logic
                 array chip; two bit partitioning",
  treatment =    "N New Development; X Experimental",
}

@Article{Miranker:1975:IDF,
  author =       "W. L. Miranker and A. Morreeuw",
  title =        "Interpolation with discontinuous functions:
                 {Application} to calculation of shocks",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "384--397",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76.65",
  MRnumber =     "51 \#9661",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "317.65004",
  abstract =     "An interpolation procedure, which uses a step function
                 plus a polynomial correction, is devised and studied
                 for application to the numerical solution of problems
                 having discontinuous solutions. The interpolation
                 procedure is applied to the calculation of shock waves
                 produced by a single convex conservation law. The
                 resulting algorithm does not have the usual undesirable
                 numerical features associated with shock-wave
                 calculations. The stability and convergence of the
                 algorithm is also demonstrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0340D (Mathematical theory of elasticity); A4630M
                 (Vibrations, aeroelasticity, hydroelasticity,
                 mechanical waves, and shocks); B0290F (Interpolation
                 and function approximation); C4130 (Interpolation and
                 function approximation)",
  classification = "631; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm convergence; algorithm stability;
                 calculation of shocks; conservation law; discontinuous
                 functions; interpolation; interpolation procedure;
                 numerical methods; polynomial correction; shock waves;
                 shockwave calculations; single convex; step function",
  reviewer =     "G. A. Watson",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Rosenbaum:1975:MOP,
  author =       "W. S. Rosenbaum and J. J. Hilliard",
  title =        "Multifont {OCR} Postprocessing System",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "398--421",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A series of techniques is being developed to
                 postprocess noisy, multifont, nonformatted Optical
                 Character Reader (OCR) data on a word basis to (1)
                 determine if a field is alphabetic or numeric; (2)
                 verify that an alphabetic word is legitimate; (3) fetch
                 from a dictionary a set of potential entries using a
                 garbled word as a key; and (4) error-correct the
                 garbled word by selecting the most likely dictionary
                 word. Four algorithms were developed using a technique
                 called vector processing (representing alphabetic words
                 as numeric vectors) and also by applying Bayes maximum
                 likelihood solutions to correct the OCR output. The
                 result was the development of a software simulator
                 which processed sequential fields generated by the
                 Advanced Optical Character Reader (in use by the U. S.
                 Postal Service in New York City), performed the four
                 functions indicated above, and selected the correct
                 alphabetic word from a dictionary of 62,000 entries.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  classification = "723; 741",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alphabetic; Bayes maximum likelihood solutions;
                 character recognition, optical; error correction;
                 garbled word; most likely dictionary word; multifont
                 OCR; noisy OCR data; nonformatted OCR; OCR; OCR output
                 correction; optical character recognition;
                 postprocessing system; simulator; software; vector
                 processing; word processing; words",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Suits:1975:FBT,
  author =       "J. C. Suits",
  title =        "Ferromagnetism in {Bi}- and {Te}-substituted {MnRh}",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "422--423",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A series of experiments shows that substitution of Bi
                 into antiferromagnetic MnRh causes this alloy to become
                 ferromagnetic. The Curie temperature of (Mn$_0$.
                 //8Bi$_0$. $_2$) Rh is 185 degree K and the moment is
                 3.5 $\mu_B$ per formula unit. Substitution of Te
                 instead of Bi gives similar results. This effect is
                 consistent with a model of competitive ferromagnetic
                 and antiferromagnetic exchange in MnRh-type
                 compounds.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7530C (Magnetic moments and susceptibility in
                 magnetically ordered materials); A7530E (Exchange and
                 superexchange interactions in magnetically ordered
                 materials); A7530K (Magnetic phase boundaries); A7550E
                 (Antiferromagnetics); A7550 (Studies of specific
                 magnetic materials); B3110C (Ferromagnetic materials)",
  classification = "708",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(electron); antiferromagnetic exchange; Bi; bismuth
                 alloys; competitive ferromagnetic and; Curie
                 temperature; exchange interactions; ferromagnetic
                 metals; ferromagnetic properties of substances;
                 ferromagnetism; magnetic; manganese alloys; Mn/sub
                 0.8/Bi/sub 0.2/Rh; Mn/sub 0.8/Te/sub 0.2/Rh; moments;
                 rhodium alloys; substituted MnRh; Te substituted MnRh;
                 tellurium alloys",
  treatment =    "X Experimental",
}

@Article{Stacy:1975:CBQ,
  author =       "E. W. Stacy",
  title =        "Comment on: {``Bulk queue model for computer system
                 analysis''} {(IBM J. Res. Develop. {\bf 18} (1974),
                 370--372) by W. Chang}",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "4",
  pages =        "424--424",
  month =        jul,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30",
  MRnumber =     "51 \#11719",
  bibdate =      "Mon Feb 12 08:12:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Chang:1974:BQM}.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C1290 (Applications of systems theory)",
  corpsource =   "IBM System Products Div. Lab., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bulk queue; computer system analysis; model;
                 modelling; modified assumptions; operations research;
                 queueing theory; results interpretation",
  reviewer =     "J. G. C. Templeton",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fernandez:1975:CLB,
  author =       "E. B. Fern{\'a}ndez and T. Lang",
  title =        "Computation of Lower Bounds for Multiprocessor
                 Schedules",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "435--444",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B35 (68A99)",
  MRnumber =     "53 \#7437",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A multiprocessing system composed of identical units
                 is considered. This system is executing a set of
                 partially ordered tasks, with known execution times,
                 using a nonpreemptive scheduling strategy. Lower bounds
                 on the number of processors required to compute the
                 tasks before a deadline, and on the minimum time to
                 execute the tasks with a fixed number of processors,
                 are of great value for the determination of the
                 corresponding optimal schedules. In this paper, methods
                 for the efficient computation of the lower bounds
                 obtained by E. Fernandez and B. Bussell are discussed.
                 Computational improvements for the case of general
                 partial orders are reported, and further reductions of
                 the number of operations are shown to be possible for
                 special graphs (trees, independent chains, independent
                 tasks).",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "723",
  corpsource =   "Data Processing Div., IBM Sci. Center, Los Angeles,
                 CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; execution times; general
                 partial; graphs; identical processors; lower bounds;
                 lower bounds computation; multiprocessing;
                 multiprocessing systems; multiprocessor schedules;
                 multiprocessor scheduling theory; nonpreemptive; number
                 of processors; optimal schedules; orders; scheduling
                 strategy; set of partially ordered tasks; system",
  reviewer =     "Sven-{\AA}ke Gustafson",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ghanem:1975:DPM,
  author =       "M. Z. Ghanem",
  title =        "Dynamic Partitioning of the Main Memory Using the
                 Working Set Concept",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "445--450",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B05 (68A50)",
  MRnumber =     "52 \#16555",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An algorithm to divide the main memory among N
                 competing programs with different characteristics,
                 running in a multiprogramming and virtual memory
                 environment, is proposed. The algorithm is based on an
                 optimal allocation policy, which is derived in this
                 paper, using the concept of the working set. A brief
                 description of the hardware implementation of the
                 algorithm is also presented. It is shown that under
                 this optimal allocation policy ``the value of a
                 page-frame'' (the amount of reduction in the page fault
                 rate if an additional page frame is allocated to that
                 program) to each program is the same.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; computer operating systems; computer
                 systems programming --- Multiprogramming; dynamic;
                 environment; hardware implementation; main memory;
                 memory partitioning; multiprogramming; N competing;
                 optimal allocation; page fault rate; page frame value;
                 partitioning; policy; programs; variable partitioning;
                 virtual memory environment; virtual storage; working
                 set concept",
  reviewer =     "Rainer Burkard",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ghanem:1975:SMP,
  author =       "M. Z. Ghanem",
  title =        "Study of Memory Partitioning for Multiprogramming
                 Systems with Virtual Memory",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "451--457",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B05 (68A50)",
  MRnumber =     "52 \#16556",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The effect that the shape of the lifetime function has
                 on the optimal partition of the main memory of a
                 computer among $N$ programs, where the criterion of
                 optimality is maximization of CPU utilization is
                 investigated. A simple queueing model is used as a base
                 for understanding this interrelationship. The lifetime
                 function is the average of the execution intervals of a
                 program as a function of the amount of memory
                 allocated. When the lifetime function is convex and is
                 proportional to $m^\alpha$, where $m$ is the size of
                 memory, then the optimal partition is obtained by
                 dividing the main memory equally among $q$ of the $N$
                 programs ($q$ is the optimal degree of
                 multiprogramming). Thus, the best partition is always
                 one of two policies: allocate all memory equally among
                 the $q$ programs or allocate all memory to one program.
                 When the lifetime function has a degenerate $S$ shape
                 (is proportional to $m^\alpha$ when $m \leq m_0$ and
                 remains constant beyond $m_0$), then there exists a
                 memory size $m$ such that no program can have a memory
                 size other than $m$ or $m_0$; if any program has a
                 memory size greater than $m_0$, each other program
                 should have a memory size that is equal to or greater
                 than $m_0$.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer system; computer
                 systems programming --- Multiprogramming; CPU
                 utilisation maximisation; criterion of optimality;
                 dynamic partitioning; execution; intervals; lifetime
                 function; main memory; memory; memory partitioning;
                 multiprogramming; multiprogramming systems; N; optimal
                 partition; programs; queueing model; virtual; virtual
                 memory; virtual storage",
  reviewer =     "Rainer Burkard",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lavenberg:1975:IRS,
  author =       "S. S. Lavenberg and D. R. Slutz",
  title =        "Introduction to Regenerative Simulation",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "458--462",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A recently developed method for estimating confidence
                 intervals when simulating stochastic systems having a
                 regenerative structure is reviewed. The paper is
                 basically tutorial, but also considers the pragmatic
                 issue of the simulation duration required to obtain
                 valid estimates. The method is illustrated in terms of
                 simulating the M/G/1 queue. Analytic results for the
                 M/G/1 queue are used to determine the validity of the
                 simulation results.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1220 (Simulation, modelling and identification)",
  classification = "922",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "intervals; M/G/1 queue; method for estimating
                 confidence; probability; queueing theory; Queueing
                 Theory; regenerative; regenerative simulation;
                 simulating stochastic systems; simulation; simulation
                 duration; statistical methods; stochastic systems;
                 structure",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lavenberg:1975:RSQ,
  author =       "S. S. Lavenberg and D. R. Slutz",
  title =        "Regenerative Simulation of a Queueing Model of an
                 Automated Tape Library",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "463--475",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recently, techniques have been developed for
                 estimating confidence intervals when simulating
                 stochastic systems having a regenerative structure.
                 These techniques are applied to the simulation of a
                 queueing model of a computer system's automated tape
                 library. Theoretical and practical issues related to
                 the application of these techniques are addressed. An
                 interesting feature of the automated tape library
                 represented in the queueing model is that certain
                 queues have finite capacity; when these queues are
                 filled to capacity certain services are prevented from
                 occurring. The regenerative techniques are used in
                 conjunction with multiple comparison procedures to make
                 statistically valid statements about the effect of the
                 finite queue capacities on performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C0310 (EDP management); C6150J (Operating systems)",
  classification = "723; 922",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated tape library; computer installation;
                 computer systems programming; estimating confidence
                 intervals; finite queue capacities; multiple comparison
                 procedures; probability; queueing models; queueing
                 theory; regenerative; regenerative structure;
                 simulating stochastic systems; simulation; statements;
                 statistically valid; stochastic systems",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chang:1975:SSQ,
  author =       "W. Chang",
  title =        "Sequential Server Queues for Computer Communication
                 System Analysis",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "476--485",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30 (68A99)",
  MRnumber =     "52 \#12124",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "343.68032",
  abstract =     "A queueing model with two sequential servers is
                 developed to analyze performance in computer and
                 communication systems. In one case the CPU is the first
                 server and the terminal and its associated
                 communications equipment are the second server. In a
                 second case the CPU and the channel are the first
                 server and the auxiliary storage device is the second
                 server. The queueing behavior of the sequential server
                 systems with Poisson arrivals, general service time
                 distributions, and several service disciplines,
                 including bulk arrivals, message priorities, and the
                 input and output queues. The stationary distributions
                 of the queue lengths and waiting times are determined
                 by using an imbedded Markov chain analysis. Several
                 examples are given to illustrate the applications of
                 these models to practical problems.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6210L (Computer
                 communications); C1140C (Queueing theory); C5620
                 (Computer networks and techniques)",
  classification = "723; 922",
  corpsource =   "Data Processing Div. Headquarters, White Plains, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bulk arrivals; chain analysis; communication; computer
                 networks; computer systems; computers; distributions;
                 general service time distributions; imbedded Markov;
                 input queues; message priorities; output queues;
                 Poisson arrivals; probability --- Queueing Theory;
                 queue lengths; queueing behaviour; queueing models;
                 queueing theory; sequential server queues; sequential
                 server systems; service disciplines; stationary; system
                 analysis; systems; telecommunication; two sequential
                 servers; waiting times",
  reviewer =     "Erol Gelenbe",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wu:1975:ALT,
  author =       "R. M. Wu and Yen Bin Chen",
  title =        "Analysis of a Loop Transmission System with
                 Round-Robin Scheduling of Services",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "486--493",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30 (65C05)",
  MRnumber =     "52 \#12125",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A finite population, multiqueue model is developed for
                 a loop transmission system. Approximate expressions for
                 the state transition matrix and other system variables
                 are derived in recursive forms. It is also shown that a
                 number of useful system parameters, such as average
                 message response time, average cycle time, and average
                 response time conditioned on message length, can be
                 obtained. The analytical results have been validated by
                 simulation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)B6210Z (Other data transmission); C1140C
                 (Queueing theory)",
  classification = "922",
  corpsource =   "IBM Systems Communications Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "average cycle; average message response time;
                 conditioned response time; finite; loop transmission
                 system; message length; multiqueue model; parameters;
                 population models; probability; queueing theory;
                 recursive expressions; round robin scheduling; state
                 transition matrix; switching networks; system; time",
  reviewer =     "Erol Gelenbe",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Herzog:1975:OSS,
  author =       "U. Herzog",
  title =        "Optimal Scheduling Strategies for Real-Time
                 Computers",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "5",
  pages =        "494--504",
  month =        sep,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B35 (68A99 60K30)",
  MRnumber =     "53 \#12559",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In order to fulfill response time constraints in
                 real-time systems, demands are often handled by means
                 of sophisticated scheduling strategies. This paper
                 first shows how to describe and analyze arbitrary
                 combinations of preemptive and nonpreemptive
                 (head-of-the-line) priority strategies and, second,
                 presents an algorithm that yields the optimal priority
                 strategy, taking into consideration constraints on the
                 response time.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5400 (Analogue and digital computers and systems);
                 C6150J (Operating systems)",
  classification = "723",
  corpsource =   "Inst. Switching Techniques and Data Processing, Univ.
                 of Stuttgart, Stuttgart, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "combined; computer systems, digital; nonpreemptive
                 strategies; optimal priority strategy; optimal
                 scheduling strategies; optimisation; preemptive
                 strategies; preemptive/nonpreemptive strategies;
                 priority; real time computers; real-time systems;
                 response time constraints; scheduling; scheduling
                 strategies; strategies",
  reviewer =     "I. Vaduva",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Tu:1975:TLI,
  author =       "Y. O. Tu",
  title =        "Theory of Liquid Ink Development in
                 Electrophotography",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "514--522",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When an electric field is present across two different
                 fluid dielectrics having a common plane boundary, some
                 disturbances in the interfacial boundary are found to
                 grow in time. The liquid ink development process is
                 viewed as the result of varying instability of the
                 oil-ink interface as a function of the differing field
                 gradient in light and dark areas of the exposed image.
                 In an analysis of the disturbances into normal modes,
                 the theory relates the effects upon instability due to
                 potential difference across the oil, the surface
                 tension, the respective viscosities of the oil and the
                 ink, and the finite thicknesses of the oil, ink, and
                 the photoconductor layer. The threshold potential
                 difference for the onset of instability is also
                 given.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0768 (Photography, photographic instruments and
                 techniques)",
  classification = "742; 745",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "differing field; electrophotography; gradient; liquid
                 ink development; normal modes; oil ink interface
                 instability; photographic reproduction; potential
                 difference; printing --- Electrostatic; surface;
                 tension; thickness dependence; viscosities",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dimsdale:1975:MS,
  author =       "B. Dimsdale and K. Johnson",
  title =        "Multiconic Surfaces",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "523--529",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D10",
  MRnumber =     "52 \#12293",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "323.50003",
  abstract =     "Multiconic surfaces are a generalization of the type
                 of surface called polyconic in numerical control of
                 machine tools. The general theory is developed in this
                 paper using a new parametrization. In the original form
                 there was a problem as to whether or not a point that
                 satisfies surface equations actually belonged to the
                 intended surface. This difficulty is removed by the new
                 technique. Algorithms for calculation of line and plane
                 intersections with the surface and for calculation of
                 normal vectors, volume, and surface area are given for
                 classes of defining functions of which it is required
                 only that they have appropriate conditions of
                 continuity and differentiability.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1310 (Control system analysis and synthesis methods);
                 C3355Z (Control applications in other manufacturing
                 processes)",
  classification = "603; 731",
  corpsource =   "IBM Los Angeles Sci. Center, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "control systems, numerical --- Computer Applications;
                 equations; line intersections; machine tools;
                 multiconic; normal vectors; numerical control;
                 numerically-controlled machine tools; parametrization;
                 plane intersections; processing times; spline
                 functions; surface; surface area; surfaces; volume",
  reviewer =     "J. Buchanan",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wang:1975:TVC,
  author =       "P. P. Wang and O. S. Spencer",
  title =        "Threshold Voltage Characteristics of
                 Double-Boron-Implanted Enhancement-Mode {MOSFETs}",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "530--538",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Threshold voltage characteristics are presented for a
                 double boron-ion-implanted n-channel enhancement MOSFET
                 device for high speed logic circuit applications. A 15-
                 OMEGA -cm high resistivity p-type (100) substrate was
                 used to achieve low junction capacitance and low
                 threshold substrate sensitivity. A shallow boron
                 implant was used to raise the threshold voltage, and a
                 second, deeper, boron implant was used to increase the
                 punch-through voltage between the source and the drain.
                 This design is especially beneficial for short channel
                 devices, while maintaining the low junction capacitance
                 and low threshold substrate sensitivity of the high
                 resistivity substrate.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560S (Other field effect devices)",
  classification = "712; 714",
  corpsource =   "IBM System Communications Div. Lab., Kingston, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "capacitance; dimensional analysis; double B implanted;
                 enhancement mode MOSFET; field effect transistors; high
                 speed logic circuit applications; low junction; low
                 threshold substrate sensitivity; one; punch through
                 voltage; quasi two dimensional analysis; semiconductor
                 materials --- Ion Implantation; short channel effect;
                 threshold; transistors, field effect; voltage",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dave:1975:CIS,
  author =       "J. V. Dave and P. Halpern and H. J. Myers",
  title =        "Computation of Incident Solar Energy",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "539--549",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Computations of the daily and annual totals of the
                 solar energy incident upon south-facing tilted flat
                 surfaces were carried out for several cloud-free
                 atmospheric models after taking into account, somewhat
                 arbitrarily, the contribution due to sky radiation and
                 that due to radiation reflected by the ground.
                 Representative variations of these quantities are
                 discussed as a function of several parameters such as
                 geographical latitude of the location, tilt angle of
                 the surface, atmospheric transmission characteristics,
                 sky-radiation contribution, and ground reflectivity.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9260 (Lower atmosphere)",
  classification = "657",
  corpsource =   "IBM Data Processing Div. Sci. Center, Palo Alto, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atmospheric; cloudfree atmospheric models; facing
                 tilted flat surface; geographical latitude; ground
                 reflectivity; incident solar energy; radiation; sky;
                 solar power; solar radiation; south; sunlight; tilt
                 angle; transmission characteristics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Easton:1975:MID,
  author =       "M. C. Easton",
  title =        "Model for Interactive Data Base Reference String",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "550--556",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "55 \#7001",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A particularly simple Markov chain model for a
                 reference string is described. The model, which is only
                 slightly more complicated than the independent
                 reference model, generates strings that have a locality
                 property and that have a specified probability
                 distribution of references over pages. Expressions are
                 obtained for expected working-set size and expected
                 working-set miss ratio. The model is used in an
                 examination of the effect of grouping pages into blocks
                 and in a discussion of the problem of evaluating the
                 effect of changes in the size of the data base.
                 Predictions of the model are shown to agree closely
                 with observations of a string of data base references
                 generated by an interactive data base system having a
                 large number of concurrent users.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, digital; distribution; effect of
                 grouping pages into blocks; file organisation;
                 interactive data base reference string; interactive
                 data base system; locality property; Markov chain
                 model; Markov processes; reference probability; working
                 set miss ratio; working set size",
  reviewer =     "Petre Preoteasa",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Flehinger:1975:HSC,
  author =       "B. J. Flehinger and R. L. {Engle, Jr.}",
  title =        "{Heme}: a Self-Improving Computer Program for
                 Diagnosis-Oriented Analysis of Hematologic Diseases",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "557--564",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "HEME, a computer program for diagnosis-oriented
                 analysis of hematologic diseases, accepts as input
                 information about a patient and provides as output an
                 ordered list of suggested diagnoses, an analysis of the
                 logic behind these diagnoses, and a list of tests
                 relevant to these diagnoses and not yet performed. The
                 decision algorithm is based on Bayes' Theorem. Each
                 disease in the system is individually analyzed, and the
                 probability that the patient has the disease vs the
                 probability that he does not is calculated. Bayesian
                 methods of statistical inference are utilized in that
                 the prior probabilities of the diseases and the
                 probabilities of findings in given diseases were
                 initially estimated from the judgement of experienced
                 hematologists with the intention that they be modified
                 automatically as data are accumulated. This program is
                 intended for use in teaching hematology, as an aid to
                 diagnosis, and as a means for studying the diagnostic
                 process.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7330 (Biology and medical computing)",
  classification = "461; 462; 723; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Bayes methods; Bayes' Theorem; biomedical applications
                 of computers; biomedical engineering; decision
                 algorithm; diagnosis; haematologic diseases; oriented
                 analysis; patient; probability --- Computer
                 Applications; self improving computer program;
                 statistical inference; teaching",
  treatment =    "P Practical",
}

@Article{Ho:1975:MNA,
  author =       "C. W. Ho",
  title =        "Modified Nodal Approach to {DC} Network Sensitivity
                 Computation",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "565--574",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "55 \#2380",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Programming techniques are presented for computing DC
                 sensitivity vectors of nonlinear electronic circuits.
                 The modified nodal approach is used as the method of
                 formulation for the circuit equations, in which
                 multiple performance objectives can be accommodated.
                 Numerical examples illustrate some of the techniques
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1160 (Nonlinear network analysis and design)",
  classification = "703",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit equations; computer-aided circuit design; DC
                 network sensitivity; electric networks; modified nodal
                 approach; multiple; nonlinear electronic circuits;
                 nonlinear network analysis; performance objectives;
                 programming techniques; sensitivity analysis",
  reviewer =     "Jerrold S. Rosenbaum",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pazel:1975:MCP,
  author =       "D. P. Pazel",
  title =        "Mathematical Construct for Program Reorganization",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "575--581",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05",
  MRnumber =     "52 \#9664",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A mathematical formalism is described through which a
                 program is given a symbolic representation and, with
                 the application of several basic formulas, may be
                 transformed into a equivalent representation giving
                 rise to a reorganized program. Examples are given in
                 which programs are simplified (e.g., code is reduced)
                 or reorganized into a structured form. In effect a
                 mathematics is described that applies to programs in
                 much the same manner as Boolean algebra applies to
                 switching circuits.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6110
                 (Systems analysis and programming)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; equivalent representation;
                 mathematical formalism; program reorganization; program
                 simplification; programming theory; representation;
                 structured form; structured programming; symbolic",
  reviewer =     "Andrzej Blikle",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lew:1975:SRB,
  author =       "J. S. Lew",
  title =        "On some relations between the {Laplace} and {Mellin}
                 transforms",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "582--586",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "44A15",
  MRnumber =     "52 \#8808",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Several earlier papers have applied some identities
                 relating the Laplace and Mellin transforms; this note
                 develops certain such identities, achieving greater
                 generality and rigor. Specifically each of these
                 transforms is expressed as a contour integral involving
                 the other, and an expansion of the Laplace transform is
                 derived in terms of the functions (s multiplied by
                 (times) d/ds)**n(1 plus s)** minus **1 with
                 coefficients defined by the Mellin transform.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0230 (Integral transforms); C1130 (Integral
                 transforms)",
  classification = "921",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "contour integral; Laplace transform; Laplace
                 transforms; mathematical transformations; Mellin
                 transform; relations between transforms; transforms",
  reviewer =     "V. M. Bhise",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Schneider:1975:AGF,
  author =       "J. Schneider",
  title =        "Amorphous {GdCoCr} Films for Bubble Domain
                 Applications",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "587--590",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Amorphous GdCoCr films of various composition ratios
                 made by RF bias sputtering are investigated for their
                 applicability as bubble domain supporting
                 materials. Film compositions around
                 {Gd$_{0.13}$Co$_0$_6.5Cr$_{0.2}$}$_2$ have
                 temperature--insensitive magnetizations between 240 K
                 and 350 K with T(comp) approximately equals 120 K and
                 T$_c$ approximately equals 630 K. Reduction of the Cr
                 content from 21.8 to 20.3 at. percent causes an
                 increase of the magnetization by a factor of
                 three. Thermal cycling of these films between 290 K and
                 570 K does not change the magnetization noticeably, nor
                 does annealing for up to six days at 520 K.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7550 (Studies of specific magnetic materials); A7560E
                 (Magnetization curves, hysteresis, Barkhausen and
                 related effects); A7570K (Domain structure in magnetic
                 films (magnetic bubbles)); B3110C (Ferromagnetic
                 materials); B3120L (Magnetic bubble domain devices);
                 B3120N (Magnetic thin film devices)",
  classification = "708; 721",
  corpsource =   "German Mfg. Technol. Center, IBM, Sindelfingen, West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.13/Co/sub 0.65/Cr/sub 0.22/; alloys; amorphous;
                 amorphous state; bubble domain applications; chromium
                 alloys; cobalt alloys; contamination; data storage,
                 magnetic --- Bubbles; films; gadolinium; Gd/sub; heat
                 treatment of alloys; magnetic; magnetic bubbles;
                 magnetic materials; magnetisation; magnetizations;
                 O/sub 2/; RF bias sputtering; temperature sensitivity;
                 thermal cycling; thin films",
  treatment =    "X Experimental",
}

@Article{Talke:1975:EST,
  author =       "F. E. Talke and R. C. Tseng",
  title =        "Effect of Submicrometer Transducer Spacing on the
                 Readback Signal in Saturation Recording",
  journal =      j-IBM-JRD,
  volume =       "19",
  number =       "6",
  pages =        "591--596",
  month =        nov,
  year =         "1975",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental results for frequency response and
                 halfpulse width of digital recording signals have been
                 obtained for submicrometer transducer spacings, for the
                 case of a flexible disk flying in close proximity to a
                 rigidly mounted conventional ferrite recording head.
                 Using optical flying heights rather than an ``effective
                 spacing'', together with a modification of the M.
                 Williams --- R. Comstock write-process slope criterion,
                 an excellent agreement between experimental results and
                 theoretical predictions is obtained. This suggests that
                 the notion of effective spacing can be avoided.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120W (Other magnetic
                 material applications and devices); C5320C (Storage on
                 moving magnetic media)",
  classification = "721; 722",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Comstock write process slope criterion; data storage,
                 magnetic; digital recording signals; ferrite recording
                 head; flexible disc; frequency response; half pulse
                 width; magnetic disc and drum storage; magnetic
                 recording; optical flying heights; readback signal;
                 rigidly mounted conventional; saturation recording;
                 submicrometer transducer spacing; Williams",
  treatment =    "X Experimental",
}

@Article{Cooper:1976:DOS,
  author =       "Arthur E. Cooper and Wen T. Chow",
  title =        "Development of On-Board Space Computer Systems",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "5--19",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the functions, characteristics,
                 requirements, and design approaches of the on-board
                 computers for seven space vehicles --- Saturn I,
                 Orbiting Astronomical Observatory, Gemini, Saturn IB,
                 Saturn V, Skylab, and Space Shuttle. The data contained
                 in this paper represent an encapsulation of sixteen
                 years of space-borne-computer development. In addition,
                 the evolution of computer characteristics such as size,
                 weight, power consumption, computing speed, memory
                 capacity, technology, architectural features, software,
                 and fault-tolerant capabilities, is summarized and
                 analyzed to point out the design trends and the
                 motivating causes. The evolution in utilization of the
                 on-board computers; their interface with sensors,
                 displays, and controls; and their interaction with
                 operators are summarized and analyzed to show the
                 increasing role played by computers in the overall
                 space-vehicle system.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9480 (Instrumentation and techniques for aeronomy,
                 space physics, and cosmic rays); B7630 (Avionic systems
                 and aerospace instrumentation); C7300 (Natural sciences
                 computing); C7490 (Computing in other engineering
                 fields)",
  classification = "655; 656; 722; 723",
  corpsource =   "IBM Federal Systems Div., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace applications of computers; aerospace
                 control; aerospace instrumentation; characteristics;
                 computer architecture --- Microprogramming; computer
                 systems programming; computer systems, digital ---
                 Fault Tolerant Capability; computers; computers ---
                 Aerospace Applications; design; functions; natural
                 sciences applications of; onboard systems; reviews;
                 space computer systems; space vehicles",
  treatment =    "G General Review",
}

@Article{Sklaroff:1976:RMT,
  author =       "Joel R. Sklaroff",
  title =        "Redundancy Management Technique for Space Shuttle
                 Computers",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "20--28",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes how a set of off-the-shelf
                 general purpose digital computers is being managed in a
                 redundant avionic configuration while performing
                 flight-critical functions for the Space Shuttle. The
                 description covers the architecture of the redundant
                 computer set, associated redundancy design
                 requirements, and the technique used to detect a failed
                 computer and to identify this failure on-board to the
                 crew. Significant redundancy management requirements
                 consist of imposing a total failure coverage on all
                 flight-critical functions, when more than two redundant
                 computers are operating in flight, and a maximum
                 failure coverage for limited storage and processing
                 time, when only two are operating. The basic design
                 technique consists of using dedicated redundancy
                 management hardware and software to allow each computer
                 to judge the ``health'' of the others by comparing
                 computer outputs and to ``vote'' on the judgments.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9480 (Instrumentation and techniques for aeronomy,
                 space physics, and cosmic rays); B7630 (Avionic systems
                 and aerospace instrumentation); C7490 (Computing in
                 other engineering fields)",
  classification = "655; 722; 723",
  corpsource =   "IBM Federal Systems Div., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace; aerospace applications of computers;
                 computers --- Redundancy; computers, digital ---
                 General Purpose Application; design; failure coverage;
                 fault tolerant computing; instrumentation; maximum;
                 redundancy; redundancy management; redundant avionic
                 configuration; space; Space Shuttle computers; space
                 shuttles; total failure coverage; vehicles",
}

@Article{Kidd:1976:PME,
  author =       "Robert H. {Kidd III} and Robert H. {Wolfe, Jr.}",
  title =        "Performance Modeling of {Earth} Resources Remote
                 Sensors",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "29--39",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A technique is presented for constructing a
                 mathematical model of an Earth resources remote sensor.
                 The technique combines established models of electronic
                 and optical components with formulated models of scan
                 and vibration effects, and it includes a model of the
                 radiation effects of the Earth's atmosphere. The
                 resulting composite model is useful for predicting
                 in-flight sensor performance, and a descriptive set of
                 performance parameters is derived in terms of the
                 model. A method is outlined for validating the model
                 for each sensor of interest. The validation for one
                 airborne infrared scanning system is accomplished in
                 part by a satisfactory comparison of predicted response
                 with laboratory data for that sensor.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B7230C
                 (Photodetectors); B7710 (Geophysical techniques and
                 equipment); C3240D (Electric transducers and sensing
                 devices)",
  classification = "443; 641; 723; 732; 741",
  corpsource =   "IBM Federal Systems Div., Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "airborne infrared scanning system; atmosphere;
                 atmospheric radiation; Earth resources remote sensor;
                 Earth's; image processing --- Vibrations; infrared
                 detectors; infrared imaging; modelling; natural;
                 performance; radiation effects; remote sensing;
                 sciences applications of computers; terrestrial
                 atmosphere",
  treatment =    "P Practical",
}

@Article{Bernstein:1976:DIP,
  author =       "Ralph Bernstein",
  title =        "Digital Image Processing of {Earth} Observation Sensor
                 Data",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "40--57",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:27:32 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes digital image processing
                 techniques that were developed to precisely correct
                 Landsat multispectral Earth observation data and gives
                 illustrations of the results achieved, e.g., geometric
                 corrections with an error of less than one picture
                 element, a relative error of one-fourth picture
                 element, and no radiometric error effect. Techniques
                 for enhancing the sensor data, digitally mosaicking
                 multiple scenes, and extracting information are also
                 illustrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B7710
                 (Geophysical techniques and equipment); C7300 (Natural
                 sciences computing)",
  classification = "723; 732; 741; 941",
  corpsource =   "IBM Federal Systems Div., Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data; data processing; digital image processing;
                 digital systems; digitally; enhancement; ERTS;
                 geometric corrections; image processing; information
                 extraction; infrared imaging; LANDSAT; Landsat
                 multispectral Earth; mosaicking multiple scenes;
                 natural; observation data; optical instruments ---
                 Infrared; picture processing; remote sensing;
                 satellites --- Television Equipment; sciences
                 applications of computers",
  treatment =    "P Practical",
}

@Article{Coon:1976:SAC,
  author =       "Thomas R. Coon and John E. Irby",
  title =        "{Skylab} Attitude Control System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "58--66",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The attitude stabilization and control system for
                 Skylab evolved from an analog controller into a fully
                 digital processing system. Features of this system
                 include a software-determined attitude reference to
                 provide general maneuvering ability, an in-orbit
                 programming capability, the use of large control moment
                 gyros for attitude control, and the use of vehicle
                 maneuvers to desaturate gyro momentum. The objectives,
                 requirements, and implementations of the control system
                 software are described, along with the rationales for
                 certain design decisions and discussion of some system
                 dynamics and actual performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3120C (Spatial variables control); C3360L (Aerospace
                 control); C7420 (Control engineering computing)",
  classification = "655; 722; 723; 731; 943",
  corpsource =   "IBM Federal Systems Div., Huntsville, AL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "attitude control; computers; computers, digital ---
                 Special Purpose Applications; control; control
                 engineering applications of; control systems, digital;
                 digital control; digital processing; gyroscopes;
                 Skylab; Skylab attitude control system; space vehicles;
                 system software",
  treatment =    "P Practical",
}

@Article{Hudson:1976:LST,
  author =       "Frederick J. Hudson",
  title =        "{Large Space Telescope}",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "67--74",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Large Space Telescope, which is scheduled to be
                 put into orbit above the Earth's atmosphere by NASA in
                 the early 1980s, is a large, multipurpose optical
                 instrument that is being designed to provide an
                 increase in observational capability of nearly 100
                 multiplied by with respect to brightness, 10 multiplied
                 by in resolving power, and a substantial bandwidth
                 improvement over ground-based facilities. This paper
                 describes, from a functional performance viewpoint, the
                 LST system and, in greater detail, the on-board Data
                 Management and Pointing Control Systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3360L (Aerospace control); C3380E (Control of
                 astronomical instruments); C7420 (Control engineering
                 computing); C7490 (Computing in other engineering
                 fields)",
  classification = "655; 656; 723; 731; 741",
  corpsource =   "IBM Federal Systems Div., Huntsville, AL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace control; computers; computers --- Aerospace
                 Applications; control; control engineering applications
                 of; control systems; data processing; data processing
                 --- Natural Sciences Applications; functional
                 performance viewpoint; Large Space Telescope; large
                 space telescope; onboard data management; physical
                 instrumentation; pointing control systems; satellites
                 --- Astronomical; space research --- Surveillance;
                 space vehicles; telescopes",
  treatment =    "P Practical",
}

@Article{Byrne:1976:LPS,
  author =       "Frank Byrne and Gordon V. Doolittle and Robert W.
                 Hockenberger",
  title =        "Launch Processing System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "75--83",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a functional description of the
                 Launch Processing System, which provides automatic
                 ground checkout and control of the Space Shuttle launch
                 site and airborne systems, with emphasis placed on the
                 Checkout, Control, and Monitor Subsystem. Hardware and
                 software modular design concepts for the distributed
                 computer system are reviewed relative to performing
                 system tests, launch operations control, and status
                 monitoring during ground operations. The communication
                 network design, which uses a Common Data Buffer
                 interface to all computers to allow
                 computer-to-computer communication, is discussed in
                 detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9480 (Instrumentation and techniques for aeronomy,
                 space physics, and cosmic rays); B7650 (Ground support
                 systems); C3360L (Aerospace control); C7420 (Control
                 engineering computing); C7490 (Computing in other
                 engineering fields)",
  classification = "655; 716; 722; 723; 731",
  corpsource =   "John F. Kennedy Space Center, NASA, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace control; airborne systems; automatic;
                 communication; computer systems programming; computer
                 to computer communications; computers; computers ---
                 Aerospace Applications; control; control engineering
                 applications of; control systems --- Telecontrol; data
                 processing; data transmission; digital communication
                 systems; functional description; ground checkout;
                 ground support systems; launch operations control;
                 Launch Processing System; modular design concepts;
                 network design; Space Shuttle launch site; space
                 shuttles; space vehicles; status monitoring; system
                 tests",
  treatment =    "P Practical",
}

@Article{Sohoni:1976:ROA,
  author =       "Vinay Shridhar Sohoni",
  title =        "Real-Time Orbiter Abort Guidance",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "1",
  pages =        "84--88",
  month =        jan,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a real-time abort guidance
                 algorithm which determines the time sequence of the
                 powered maneuvers and the orientation of the thrust
                 vector throughout an abort-mission action initiated
                 during the orbiter ascent phase. It involves guiding a
                 heavily loaded Space Shuttle vehicle, passing through
                 severe environmental conditions, back to a designated
                 landing area. A graphical example and estimates of the
                 computer requirements are included.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3360L (Aerospace control); C7420 (Control engineering
                 computing); C7490 (Computing in other engineering
                 fields)",
  corpsource =   "IBM Federal Systems Div., Huntsville, AL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace control; computer programming ---
                 Subroutines; computers; control engineering
                 applications of; guidance; orbiter ascent phase; real
                 time abort; real-time systems; Space Shuttle vehicle;
                 space shuttles; space vehicles; space vehicles ---
                 Orbits and Trajectories",
  treatment =    "P Practical",
}

@Article{Chaudhari:1976:SSB,
  author =       "P. Chaudhari and S. R. Herd",
  title =        "Submicrometer Stripes and Bubbles in Amorphous Films",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "102--108",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Lorentz microscopy is used to study amorphous thin
                 films of Gd-Co-Au and Gd-Co-Mo having a range of Q
                 values. Stripe and bubble formation are shown as a
                 function of perpendicular bias fields and pulsed or
                 rotating in-plane fields. In the presence of an
                 in-plane field, stripes contain a pair of Bloch lines
                 and break into rows of Bloch-line containing bubbles. A
                 unichiral stripe, however, forms a unichiral bubble
                 that is stable to higher perpendicular bias fields than
                 are Bloch-line bubbles. Bloch-line rotation in bubble
                 walls in the presence of external rotating fields is
                 demonstrated, and Bloch-line motion due to sweeping
                 in-plane walls is shown. The rare occurrence of four
                 Bloch lines in a 0.2- $\mu$ m bubble is observed, as is
                 the pearl-like accumulation of multiple Bloch lines in
                 walls of irregularly shaped domains.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7550 (Studies of specific magnetic materials); A7560E
                 (Magnetization curves, hysteresis, Barkhausen and
                 related effects); A7570K (Domain structure in magnetic
                 films (magnetic bubbles)); B3110C (Ferromagnetic
                 materials); B3120L (Magnetic bubble domain devices);
                 B3120N (Magnetic thin film devices)",
  classification = "547; 708; 712; 721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amorphous films; amorphous state; Bloch lines; bubble
                 formation; bubbles; cobalt alloys; data storage,
                 magnetic --- Bubbles; films; gadolinium alloys;
                 gadolinium and alloys --- Microscopic Examination;
                 Gd-Co-Au; Gd-Co-Mo thin films; Lorentz electron
                 microscopy; magnetic; magnetic bubbles; magnetic
                 materials --- Bubbles; magnetic thin films;
                 perpendicular bias fields; rotating in plane fields;
                 submicron bubbles; submicron stripes; thin films",
  treatment =    "X Experimental",
}

@Article{Argyle:1976:BLM,
  author =       "B. E. Argyle and J. C. Slonczewski and O. Voegeli",
  title =        "Bubble Lattice Motions Due to Modulated Bias Fields",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "109--122",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper investigates collective bubble motions that
                 occur in low-damping garnet films by excitation
                 involving homogeneous or nearly homogeneous fields,
                 e.g., bias-field modulations. Their gradients, if
                 significant, are in any case orthogonal to the motion
                 studied. These various motions belong to a new
                 phenomenon called bubble automotion because the
                 self-propulsion results from coupling of the principal
                 translational degree of freedom of the bubble either
                 with the internal degrees or with the orthogonal
                 component of translation. It is observed that periodic
                 variations of bias field can couple to a close-packed
                 lattice of magnetic bubbles to produce a steady
                 rotation of the bubble lattice (RBL). Pulsed fields
                 excite various other many-body phases as well. The
                 physical motions of such bubble arrays can be described
                 by ``lattice melting'', and ``rotating galaxies''. The
                 RBL phase is stable over wide ranges of pulse width and
                 amplitude when the film is thick and the lattice is
                 confined either by a circular ion-milled groove or by
                 radially symmetric inhomogeneous fields from the
                 excitation coil itself. Microsecond pulsed fields of
                 minus 0.05 multiplied by $4 \pi M_s$ applied to a
                 lattice of five-$\mu$m bubbles produce a net
                 displacement of up to 1.5 $\mu$ m/pulse at the rim of a
                 lattice 23 bubbles across and 250 $\mu$m in diameter.
                 Sinusoidal bias modulation in the range 1 to 30 MHz
                 produces a spectrum of lattice rotational velocities vs
                 frequency having both signs. At frequencies near the
                 low end of the spectrum both the magnitude and the sign
                 of the rotation are sensitive to drive amplitude. A
                 tentative theory attributes lattice rotation to
                 nonlinearities involving the bubble-deflection
                 effect.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7560E (Magnetization curves, hysteresis, Barkhausen
                 and related effects); A7570K (Domain structure in
                 magnetic films (magnetic bubbles)); B3120L (Magnetic
                 bubble domain devices); B3120N (Magnetic thin film
                 devices)",
  classification = "708; 721",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bubble arrays; bubble lattice; bubble lattice
                 rotation; bubble lattices; data storage, magnetic ---
                 Bubbles; garnets --- Thin Films; lattice rotation;
                 magnetic bubble lattices; magnetic bubbles; magnetic
                 materials; magnetic thin films; modulated bias fields;
                 motions",
}

@Article{Chen:1976:SMO,
  author =       "T. C. Chen and C. Tung",
  title =        "Storage Management Operations in Linked Uniform
                 Shift-Register Loops",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "123--131",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new storage structure, called a uniform ladder,
                 consists of a linear array of equal shift-register
                 loops, each holding one record and linked by
                 flow-steering switches. Data exchange across a loop
                 boundary is mandatory if the controlling switch is on
                 and forbidden if off. For MRU (Most Recently Used)
                 storage management, the most important operation is the
                 climbing of data to the top of the ladder from a depth
                 of D loops, which takes only (D plus 1)/2 record
                 periods in the uniform ladder. Program switching is
                 enhanced by efficient schemes for partial environmental
                 exchanges and also by internal block transfers. A
                 pushdown stack can be efficiently implemented by a
                 change in the record storing technique. The uniform
                 ladder can probably be implemented in any
                 shift-register technology, although one given design
                 uses the magnetic bubble technology. In any case, the
                 current emphasis on shift registers is for storage
                 applications, for which the uniform ladder seems very
                 well suited.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320E (Storage on stationary magnetic media); C6120
                 (File organisation)",
  classification = "721; 722; 723",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computers, digital ---
                 Shift Registers; data processing --- Data Structures;
                 data storage, magnetic --- Bubbles; flow; internal
                 block; linked uniform shift register loops; magnetic
                 bubble devices; magnetic bubbles; most recently used
                 storage management; pushdown stack; shift registers;
                 steering switches; storage management; storage
                 management operations; storage structure; transfers;
                 uniform ladder",
  treatment =    "N New Development; T Theoretical or Mathematical",
}

@Article{Collins:1976:EAC,
  author =       "T. W. Collins and R. W. Cole",
  title =        "Effects of Abrupt Changes in Film Thickness on
                 Magnetic Bubble Forces",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "132--137",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Forces on a magnetic bubble due to abrupt asymmetric
                 changes in the surface configuration of the magnetic
                 film are investigated theoretically and experimentally.
                 A model is derived for calculating the forces on a
                 bubble as it is being moved by conductor propagation
                 through a thickness gradient in the film. An experiment
                 is described in which the forces necessary to move a
                 bubble through this transition region are measured and
                 compared with predicted values computed from the model.
                 Results are presented for a 20 degree gradient with a
                 cut 0.62 $\mu$ m deep in a garnet film, nominally 3.8
                 $\mu$ m thick, prepared by liquid phase epitaxy.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7560E (Magnetization curves, hysteresis, Barkhausen
                 and related effects); A7570K (Domain structure in
                 magnetic films (magnetic bubbles)); B3120L (Magnetic
                 bubble domain devices); B3120N (Magnetic thin film
                 devices)",
  classification = "701; 708; 921; 942",
  corpsource =   "IBM General Products Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abrupt changes in film thickness; conductor
                 propagation; experimental results; film; film thickness
                 changes effects; garnets --- Thin Films; magnetic
                 bubble forces; magnetic bubbles; magnetic field
                 measurement --- Mathematical Models; magnetic
                 materials; magnetic thin films; model; thickness
                 gradient",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Markowsky:1976:BCP,
  author =       "G. Markowsky and B. K. Rosen",
  title =        "Bases for Chain-Complete Posets",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "138--147",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "06A10 (68A10)",
  MRnumber =     "52 \#13523",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper studies a basis concept directly analogous
                 to the concept of a basis for a vector space. The new
                 basis concept includes that of H. Egli and R. L.
                 Constable as a special case, and one of their theorems
                 is a corollary of the results. The paper also
                 summarizes some previously reported but little known
                 results of wide utility. For example, if every linearly
                 ordered subset (chain) in a poset (partially ordered
                 set) has a least upper bound (supremum), so does every
                 directed subset. Given posets P and Q, it is often
                 useful to construct maps g:P yields Q that are
                 chain-continuous: supremums of nonempty chains are
                 preserved. Chain-continuity is analogous to topological
                 continuity and is generally much more difficult to
                 verify than isotonicity: the preservation of the order
                 relation. This paper introduces the concept of an
                 extension basis: a subset B of P such that any isotone
                 f:B yields Q has a unique chain-continuous extension
                 g:P yields Q. Two characterizations of the
                 chain-complete posets that have extension bases are
                 obtained. These results are then applied to the problem
                 of constructing an extension basis for the poset left
                 bracket P yields Q right bracket of chain-continuous
                 maps from P to Q, given extension bases for P and Q.
                 This is not always possible, but it becomes possible
                 when a mild (and independently motivated) restriction
                 is imposed on either P or Q. A lattice structure is not
                 needed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0290 (Other topics in mathematical methods in
                 physics); B0250 (Combinatorial mathematics); C1160
                 (Combinatorial mathematics)",
  classification = "721; 723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automata theory; basis concept; chain; chain
                 continuity; complete posets; computer metatheory;
                 extension basis; isotonicity; nonempty chains;
                 partially ordered sets; posets; set theory; supremums
                 of",
  reviewer =     "Evelyn Nelson",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pimbley:1976:DFL,
  author =       "W. T. Pimbley",
  title =        "Drop Formation from a Liquid Jet: a Linear
                 One-Dimensional Analysis Considered as a Boundary Value
                 Problem",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "148--156",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Using a one-dimensional model, the author studied drop
                 formation using a boundary value perturbation, rather
                 than a spatially periodic one as considered by
                 Rayleigh. The Rayleigh solution becomes the high jet
                 velocity approximation to this linear analysis. At
                 lower velocities the analysis shows that the medium
                 becomes dispersive, and drop formation characteristics
                 are quite different from that predicted by Rayleigh. In
                 an appendix, the gross momentum balance and flow rate
                 conservation are used to consider drop formation from a
                 stream.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); A4755K (Multiphase
                 flows)",
  classification = "631; 921; 931",
  corpsource =   "IBM System Communications Div. Lab., Endicott, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boundary; boundary value problem; drop formation;
                 drops; flow of fluids --- Jets; jets; linear one
                 dimensional model; liquid jet; liquids; mathematical
                 techniques --- Boundary Value Problems; value
                 perturbation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lomet:1976:OVB,
  author =       "D. B. Lomet",
  title =        "Objects and Values: the Basis of a Storage Model for
                 Procedural Languages",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "157--167",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model for storage in procedural languages is
                 presented. Its fundamental notion is to strictly
                 distinguish values from storage objects. Several
                 difficulties in current languages are resolved in this
                 model, e.g., the problem of flexible locations and the
                 meaning of the term type. In the light of the storage
                 object\slash value dichotomy, several notions are found
                 to be covered by the term type. The implications of the
                 model are explored with respect to the more
                 conventional data constructs of procedural languages as
                 well as to sets and how they might be provided.
                 Finally, data extension mechanisms are considered.
                 Whereas the treatment here is not complete, the
                 template concept introduced in the model does suggest a
                 useful framework for providing benefits of data
                 extensibility.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140 (Programming languages)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data extension
                 mechanisms; data storage, digital; dichotomy;
                 languages; procedural languages; procedural
                 programming; programming languages; storage model;
                 storage object/value; storage objects; storage values",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chen:1976:ECC,
  author =       "C. L. Chen and R. A. Rutledge",
  title =        "Error Correcting Codes for Satellite Communication
                 Channels",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "168--175",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A10",
  MRnumber =     "56 \#5038",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper addresses the problem of efficient forward
                 error correction on differentially encoded,
                 quadriphase-shift-keying (DQPSK) channels. This
                 approach is to design codes to correct the most
                 probable error patterns. First the probability
                 distribution of error patterns is derived. Then a class
                 of convolutional codes that correct any single two-bit
                 error is described. Finally a threshold decodable code
                 that corrects all single, and many double, two-bit
                 errors is presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6250G (Satellite relay systems)",
  classification = "655; 723; 731",
  corpsource =   "IBM System Products Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "codes; codes, symbolic; communication satellites;
                 computers --- Data Communication Systems;
                 convolutional; correction; differentially encoded PSK;
                 digital communication systems; DQPSK; efficient forward
                 error; error correcting codes; error correction codes;
                 error probability distribution; information theory ---
                 Communication Channels; most probable error patterns;
                 phase; quadriphase shift keying; satellite
                 communication channels; satellite links; shift keying;
                 threshold decodable code",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Meier:1976:EMR,
  author =       "J. H. Meier and J. W. Raider",
  title =        "Electric Motor Requirements for Positioning an
                 Inertial Load",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "2",
  pages =        "176--183",
  month =        mar,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with the motor, the inertia ratio,
                 and the power input requirements for moving an inertial
                 load over a specified distance in a specified time. A
                 linear speed-torque relationship is assumed, and
                 selected motor parameters are normalized to the load to
                 establish generally applicable solutions and
                 characteristic curves. Emphasis is placed on the
                 velocity-time diagrams and the relationship among the
                 inertia ratio, the rated motor power, and the
                 electrical input power. It is shown that optimization
                 is possible for input power at stall, input power
                 immediately following torque reversal, and average
                 input power. Computer generated curves are presented
                 for these three cases, and their relationships are
                 discussed. Finally, it is shown that the motor time
                 constant has a great influence on power requirements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B8510 (Drives); C3260B (Electric actuators and final
                 control equipment)",
  classification = "705; 731",
  corpsource =   "IBM System Communications Div. Lab., Endicott, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "at stall; average input power; characteristic curves;
                 constant; control, mechanical variables --- Position;
                 drives; electric drives; electric motor; electric
                 motors; electrical input power; inertia ratio; inertial
                 load; inertial load positioning; input power; linear
                 speed torque relationship; motor parameters; motor
                 time; optimisation; power input requirements;
                 requirements; specified distance; specified time; time
                 diagrams; torque reversal; velocity",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Rissanen:1976:GKI,
  author =       "J. J. Rissanen",
  title =        "Generalized {Kraft} inequality and arithmetic coding",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "198--203",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A10",
  MRnumber =     "54 \#12359",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arithmetic coding; associated entropy; coding speed;
                 decoding; encoding; finite alphabet; finite strings;
                 generalised Kraft inequality",
  reviewer =     "Jack K. Wolf",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gustavson:1976:ABL,
  author =       "F. G. Gustavson",
  title =        "Analysis of the {Berlekamp--Massey} linear feedback
                 shift-register synthesis algorithm",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "204--212",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20 (68A20)",
  MRnumber =     "54 \#4834",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C4230 (Switching theory)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; analysis; Berlekamp Massey algorithm;
                 binary sequences; encoded length; encoding; length
                 distribution; linear feedback shift; register
                 synthesis; shift registers",
  reviewer =     "E. R. Berlekamp",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gustavson:1976:ABM,
  author =       "F. G. Gustavson",
  title =        "Analysis of the {Berlekamp--Massey} linear feedback
                 shift-register synthesis algorithm",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "??",
  pages =        "204--212",
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "351.94021",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lin:1976:DCP,
  author =       "B. J. Lin",
  title =        "{Deep-UV} conformable-contact photolithography for
                 bubble circuits",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "213--221",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120L (Magnetic bubble domain devices); B3120N
                 (Magnetic thin film devices); B3120 (Magnetic material
                 applications and devices); C5320E (Storage on
                 stationary magnetic media)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.1 micron; conformable contact photolithography; deep
                 UV photolithography; experimental results; fabrication;
                 features size range 2.5 to; high density bubble memory
                 circuits; level masking; linewidth; magnetic bubble
                 device; magnetic bubble devices; mask to wafer gap;
                 mask to wafer holder; photolithography; single;
                 tolerance requirements",
  treatment =    "N New Development; X Experimental",
}

@Article{Barker:1976:LDT,
  author =       "J. A. Barker and M. L. Klein and M. V. Bobetic",
  title =        "Lattice dynamics with three-body forces: solid {Xe}
                 and {Kr}",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "222--227",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4630C (Elasticity); A6220D (Elasticity, elastic
                 constants); A6320D (Phonon states and bands, normal
                 modes, and phonon dispersion); A8140J (Elasticity and
                 anelasticity)",
  corpsource =   "IBM San Jose Res. Labs., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0K; anharmonic effects; elastic constants; forces;
                 krypton; lattice phonons; multiparameter pair
                 potentials; phonon dispersion curves; pV isotherms;
                 quasiharmonic lattice dynamics; solid Kr; solid Xe;
                 three body; xenon; zero temperature Debye theta",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Stapper:1976:LYM,
  author =       "C. H. Stapper",
  title =        "{LSI} yield modeling and process monitoring",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "228--234",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM System Products Div. Lab., Burlington, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analytical technique; clustering of defects; IC defect
                 rate; insulator short circuits; integrated circuit
                 production; large scale integration; leaky; LSI;
                 monolithic integrated circuits; photolithographic
                 defects; pilot line data; pn junctions; process
                 monitoring; random failures; yield modelling",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bechtle:1976:DCS,
  author =       "B. Bechtle and C. Schunemann and G. Skudelny and V.
                 Zimmermann",
  title =        "Delayed closed-loop scheme for stepping motor
                 control",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "235--243",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B8340 (Small and special purpose electric machines);
                 C1340G (Time-varying control systems); C3120C (Spatial
                 variables control); C3120E (Velocity, acceleration and
                 rotation control); C3340H (Control of electric power
                 systems)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; closed loop systems; delay greater than
                 step; delayed closed loop scheme; displacement
                 characteristic; duration; high speed motor; motor
                 position control; motor speed control; position
                 control; programmed speed; stability; stepping motor
                 control; stepping motors; velocity control",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Hall:1976:OSE,
  author =       "P. A. V. Hall",
  title =        "Optimization of Single Expressions in a Relational
                 Data Base System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "244--257",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper examines optimization within a relational
                 data base system. It considers the optimization of a
                 single query defined by an expression of the relational
                 algebra. The expression is transformed into an
                 equivalent expression or sequence of expressions that
                 cost less to evaluate. Alternative transformations, and
                 combinations of several transformations, are analyzed.
                 Measurements on an experimental data base showed
                 improvements, especially in cases where the original
                 expression would be impracticably slow in its
                 execution. A small overhead was incurred, which would
                 be negligible for large data bases.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "UK Sci. Center, Peterlee, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebra; database management systems; experimental
                 data base; optimisation of single; queries; relational;
                 relational data base system; single expressions",
  owner =        "mckenzie",
  treatment =    "P Practical",
}

@Article{Bruce:1976:DIJ,
  author =       "C. A. Bruce",
  title =        "Dependence of ink jet dynamics on fluid
                 characteristics",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "258--270",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "equations; flow equation; fluid characteristics; fluid
                 viscosity; ink jet dynamics; ink jet printing; jet
                 stability; jet velocity; jets; length; polymer
                 solutions; printers; separation; separation length;
                 stream stability",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Bajorek:1976:AMM,
  author =       "C. H. Bajorek and R. J. Kobliska",
  title =        "Amorphous materials for micrometer and submicrometer
                 bubble domain technology",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "271--281",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7550G (Ferrimagnetics); A7560E (Magnetization curves,
                 hysteresis, Barkhausen and related effects); A7570K
                 (Domain structure in magnetic films (magnetic
                 bubbles)); B3110 (Magnetic materials); B3120L (Magnetic
                 bubble domain devices)B3120N (Magnetic thin film
                 devices); B3120 (Magnetic material applications and
                 devices); C5320E (Storage on stationary magnetic
                 media)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "amorphous; bubble devices; characteristics; films;
                 garnet films; high density magnetic; magnetic; magnetic
                 bubble devices; magnetic bubble materials; magnetic
                 bubbles; micron bubble domain technology; Q-values;
                 review; reviews; RF sputtering; submicrometer bubble
                 domain technology; ternary amorphous films",
  treatment =    "B Bibliography; X Experimental",
}

@Article{Nussbaumer:1976:CCF,
  author =       "H. J. Nussbaumer",
  title =        "Complex convolutions via {Fermat} number transforms",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "282--284",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "54 \#12394",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290Z (Other numerical methods); B6140 (Signal
                 processing and detection); C1260 (Information theory);
                 C4190 (Other numerical methods); C5280 (Other digital
                 techniques)",
  corpsource =   "IBM France, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complex digital filter implementation; computing
                 complex convolutions; digital filters; Fermat number
                 transforms; transforms",
  reviewer =     "G. Robert Redinbo",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Andrews:1976:SPI,
  author =       "I. M. Andrews and J. A. Leendertz",
  title =        "Speckle pattern interferometry of vibration modes",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "285--289",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0710 (Mechanical measurement methods and
                 instruments); A0760L (Optical interferometry); A4240K
                 (Holographic interferometry; other holographic
                 techniques); A4630R (Mechanical measurement methods and
                 techniques for solids); B4350 (Holography)",
  corpsource =   "IBM Hursley, Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "alignment; electronic speckle pattern methods;
                 engineering test pieces; frequency tuning; holographic
                 interferometry; identification; interferometry of
                 vibration modes; light interferometry; object;
                 resonance; speckle; three dimensional objects; time
                 average holography; vibration measurement",
  treatment =    "X Experimental",
}

@Article{Wiederhold:1976:COS,
  author =       "Gio Wiederhold",
  title =        "Comment on: {``Segment synthesis in logical data base
                 design''} {(IBM J. Res. Develop. {\bf 19} (1975),
                 71--77) by C. P. Wang and H. H. Wedekind}. With a reply
                 by the authors",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "3",
  pages =        "290--290",
  month =        may,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "56 \#1852",
  bibdate =      "Sat Feb 24 09:27:40 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Wang:1975:SSL} and comment
                 \cite{Bernstein:1976:CSS}.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "binary lexicons; data model; database management
                 systems; logical data base design; segment synthesis of
                 data bases",
  reviewer =     "W. W. Armstrong",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Heidorn:1976:APT,
  author =       "G. E. Heidorn",
  title =        "Automatic Programming Through Natural Language
                 Dialogue: a Survey",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "302--313",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68-02",
  MRnumber =     "55 \#1766",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Four research projects are described whose goal is to
                 develop an automatic programming system that can carry
                 on a natural language dialogue with a user about his
                 requirements and then produce an appropriate program.
                 The NPGS work was completed in 1972, while the work at
                 ISI, MIT and IBM is current. All are using basically
                 some form of semantic network representation for their
                 knowledge base and some form of procedural
                 specification for their natural language processing.
                 The three current projects use LISP as the
                 implementation language but are working on other
                 languages. Target languages vary. Issues and problems
                 in the research area are reviewed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6140D (High
                 level languages)",
  classification = "723",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic programming; automatic programming system;
                 computer metatheory --- Programming Theory; computer
                 programming; computer programming languages; natural
                 language dialogue; procedure oriented languages;
                 programming",
  reviewer =     "S. Huzino",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Petrick:1976:NLB,
  author =       "S. R. Petrick",
  title =        "On Natural Language Based Computer Systems",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "314--325",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Some of the arguments that have been given both for
                 and against the use of natural languages in
                 question-answering and programming systems are
                 discussed. Several natural language based computer
                 systems are considered in assessing the current level
                 of system development. These are the Lunar Sciences
                 Natural Language Information System (LSNLIS), the
                 Rapidly Extensible Language (REL), the SHRDLU system
                 and the Natural Language Processing (NLP) system.
                 Finally, certain pervasive difficulties that have
                 arisen in developing natural language based systems are
                 identified, and the approach taken to overcome them in
                 the REQUEST (Restricted English QUESTion-Answering)
                 System is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6140D (High
                 level languages)",
  classification = "723; 901",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; computer programming languages;
                 computer systems, digital; information retrieval
                 systems; natural language based computer systems;
                 procedure oriented languages; programming; REQUEST",
  treatment =    "P Practical",
}

@Article{Plath:1976:RNL,
  author =       "W. J. Plath",
  title =        "{Request}: a Natural Language Question-Answering
                 System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "326--335 (or 326--334??)",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "REQUEST is an experimental Restricted English
                 QUESTion-answering system that can analyze and answer a
                 variety of English questions, spanning a significant
                 range of syntactic complexity, with respect to a small
                 Fortune-500-type data base. REQUEST uses a language
                 processing approach featuring: (1) the use of
                 restricted English; (2) a two-phase, compiler-like
                 organization; and (3) linguistic analysis based on a
                 transformational grammar. The paper explores the
                 motivation for this approach in some detail and also
                 describes the organization, operation, and current
                 status of the system.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C6110 (Systems analysis
                 and programming); C6140D (High level languages); C6150C
                 (Compilers, interpreters and other processors)",
  classification = "723; 901",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "answering system; computational linguistics; computer
                 programming languages; computer systems, digital; data
                 base systems; information retrieval systems; linguistic
                 analysis; LISP; natural language question; program
                 processors; REQUEST; restricted English;
                 transformational grammar; two phase compiler like
                 organization",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Sowa:1976:CGD,
  author =       "John F. Sowa",
  title =        "Conceptual Graphs for a Data Base Interface",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "336--357",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05 (68A50)",
  MRnumber =     "55 \#13864",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A data base system that supports natural language
                 queries is not really natural if it requires the user
                 to know how the data are represented. This paper
                 defines a formalism, called conceptual graphs, that can
                 describe data according to the user's view and access
                 data according to the system's view. In addition, the
                 graphs can represent functional dependencies in the
                 data base and support inferences and computations that
                 are not explicit in the initial query.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C6120 (File
                 organisation); C6140D (High level languages)",
  classification = "723; 921",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computational linguistics; conceptual graphs; data
                 base interface; data base system; data base systems;
                 database management systems; mathematical techniques
                 --- Graph Theory; natural language; procedure oriented
                 languages; queries",
  reviewer =     "Allen Klinger",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Dimsdale:1976:BPS,
  author =       "B. Dimsdale and R. M. Burkley",
  title =        "Bicubic Patch Surfaces for High-Speed Numerical
                 Control Processing",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "358--367",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D10",
  MRnumber =     "55 \#6778",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Parametric bicubic patch surfaces have been used for
                 some time in manufacture and design. It is convenient
                 to have such surfaces available as standard numerical
                 control surfaces using the APT programming language. A
                 major drawback is that they are costly to use for data
                 processing of numerical control programs. If, however,
                 nonparametric bicubics are used, computer time, and
                 hence cost, can be reduced dramatically. This paper
                 details a strategy and algorithms for this purpose.
                 Experimental data suggest that computer costs are
                 comparable to, or somewhat lower than, the costs for
                 processing tabulated cylinder surfaces.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7420 (Control engineering computing)",
  classification = "723; 913; 922; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APT programming language; bicubic patch processes;
                 computer costs; data processing --- Manufacturing
                 Applications; high speed; mathematical techniques ---
                 Numerical Methods; numerical control; numerical control
                 processing; processing; surfaces",
  reviewer =     "Immo O. Kerner",
}

@Article{Calhoun:1976:CAB,
  author =       "B. A. Calhoun and J. S. Eggenberger and L. L. Rosier
                 and L. F. Shew",
  title =        "Column Access of a Bubble Lattice: Column Translation
                 and Lattice Translation",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "368--375",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a column-accessed bubble lattice device, accessing
                 is accomplished by first translating the lattice to
                 position the desired column of bubbles in an
                 input-output access channel and then translating this
                 column along the channel to a detector area outside of
                 the lattice while simultaneously introducing new
                 bubbles from a generator area at the other end of the
                 channel. An analysis of the influence of device design
                 parameters on access rate indicates that the most
                 important parameters are the column translation rate
                 and lattice capacity. A device is described that was
                 designed to study the translation of a lattice of
                 bubbles and of a single column of bubbles within the
                 lattice. Quasistatic operating margins and dynamic
                 measurements indicate that the column-access
                 configuration provides feasible means for the rapid
                 access of bubbles from a lattice.",
  acknowledgement = ack-nhfb,
  classification = "722",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bubble lattices; data storage, magnetic",
}

@Article{Heath:1976:DSA,
  author =       "J. S. Heath",
  title =        "Design of a Swinging Arm Actuator for a Disk File",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "389--397",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An integral disk enclosure that incorporates a novel
                 head-positioning actuator concept is used in the IBM
                 System\slash 32 and in terminal controllers, such as
                 the Retail Store Controller and the Communication
                 Controller. The actuator is based on a swinging arm
                 rather than the conventional linear carriage. The
                 geometrical, structural, and electromechanical bases of
                 the design are described.",
  acknowledgement = ack-nhfb,
  classification = "704; 722; 732",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "actuators --- Applications; data storage, magnetic",
}

@Article{Raabe:1976:FBC,
  author =       "H. P. Raabe",
  title =        "Fast Beamforming with Circular Receiving Arrays",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "398--408",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Fast Fourier Transform (FFT) can be applied to
                 circular arrays receiving wideband sonar radiation. As
                 with conventional beamforming, the FFT serves in the
                 first stage to divide the spectrum into narrow
                 frequency bands. Then the array element responses of
                 each band are analyzed in a second stage of FFTs for
                 the Fourier components (modes) of the array excitation
                 function for the respective band. Application of
                 weights of the mode responses, to simulate the
                 radiation efficiency of the modes for any given element
                 radiation pattern and to control the array pattern,
                 yields the Fourier components of the beam pattern.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4330 (Underwater sound); B0290Z (Other numerical
                 methods); B5270D (Antenna arrays); C4190 (Other
                 numerical methods); C7410F (Communications computing)",
  classification = "716; 752; 921",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "antenna arrays; antenna radiation patterns; antennas;
                 applications of computers; array; beamforming; circular
                 receiving arrays; communications; digital simulation;
                 element radiation pattern; excitation function; fast;
                 fast Fourier; fast Fourier transforms; mathematical
                 transformations --- Fast Fourier Transforms; receiving
                 antennas; sonar; transforms; wideband sonar radiation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Onton:1976:SMA,
  author =       "A. Onton and N. Heiman and J. C. Suits and W.
                 Parrish",
  title =        "Structure and Magnetic Anisotropy of Amorphous {Gd-Co}
                 Films",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "409--411",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is found that the structure of amorphous Gd-Co
                 films, as revealed by x-ray diffraction, is correlated
                 with the magnitude of bias voltage present during the
                 sputter deposition. Films sputter deposited with zero
                 bias voltage typically show one broad peak in an x-ray
                 diffraction spectrum, and films sputter deposited with
                 minus 100 volts bias show two broad peaks with a
                 shoulder between them. These structural differences
                 appear to be related to the perpendicular magnetic
                 anisotropy in these films.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A6860 (Physical properties of thin films,
                 nonelectronic); A7530G (Magnetic anisotropy); A7550
                 (Studies of specific magnetic materials); A7570
                 (Magnetic films and multilayers); B3110C (Ferromagnetic
                 materials)",
  classification = "801; 804; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amorphous Gd-Co films; bias voltage; cobalt alloys;
                 diffraction; films; gadolinium alloys; gadolinium
                 compounds --- Anisotropy; magnetic anisotropy; magnetic
                 thin films; noncrystalline state structure; sputter
                 deposition; sputtering; structure; X-ray; x-ray
                 analysis --- Applications; X-ray diffraction
                 examination of materials",
  treatment =    "X Experimental",
}

@Article{Bernstein:1976:CSS,
  author =       "Philip A. Bernstein",
  title =        "Comment on: {``Segment synthesis in logical data base
                 design''} {(IBM J. Res. Develop. {\bf 19} (1975),
                 71--77) by C. P. Wang and H. H. Wedekind}. With a reply
                 by the authors",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "4",
  pages =        "412--412",
  month =        jul,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "56 \#1853",
  bibdate =      "Sat Feb 24 09:28:36 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Wang:1975:SSL} and comment
                 \cite{Wiederhold:1976:COS}.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  corpsource =   "Dept. of Computer Sci., Univ. of Toronto, Toronto,
                 Ont., Canada",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "file organisation; logical data base design; segment
                 synthesis",
  reviewer =     "W. W. Armstrong",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Inselberg:1976:CSI,
  author =       "A. Inselberg",
  title =        "Cubic Splines with Infinite Derivatives at Some
                 Knots",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "430--436",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D05",
  MRnumber =     "54 \#9039",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A generalization of cubic spline interpolation with
                 vertical slopes at some knots is proposed. An existence
                 theorem including an algorithm for constructing such
                 generalized splines is proved. The resulting splines
                 are obtained in closed form and they are partition
                 invariant.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4130 (Interpolation and function approximation)",
  classification = "408; 931",
  corpsource =   "IBM Data Processing Div. Sci. Center, Los Angeles, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; cubic spline interpolation; existence
                 theorem; generalized splines; invariant splines; knots;
                 partition; splines (mathematics); structural design ---
                 Computer Applications; surfaces; vertical slopes",
  reviewer =     "Claude Carasso",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lavenberg:1976:SMP,
  author =       "S. S. Lavenberg and G. S. Shedler",
  title =        "Stochastic Modeling of Processor Scheduling with
                 Application to Data Base Management Systems",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "437--448",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B35 (68A99)",
  MRnumber =     "54 \#2178",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The processing services rendered in searching the data
                 base in a DBS and retrieving and processing information
                 are modeled explicitly, as is the algorithm used to
                 schedule these services on the processor. The
                 scheduling of the processor is based on a total
                 priority ordering of a set of queues for processing
                 service. A queuing model incorporating the processor
                 scheduling algorithm for IMS (Information Management
                 System) is formulated in order to illustrate the
                 modeling ideas. The model is not used in a performance
                 study of IMS. The model is illustrative of stochastic
                 models which can be constructed to incorporate
                 algorithms for processor scheduling.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140C (Queueing theory); C6120 (File organisation);
                 C6150J (Operating systems)",
  classification = "723; 921; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; cumulative processes; data base management
                 systems; data base systems; database management
                 systems; information retrieval systems --- Scheduling;
                 mathematical models; modelling; probability ---
                 Queueing Theory; processing services; processor
                 scheduling; queueing model; queueing theory;
                 scheduling; stochastic modelling; stochastic processes;
                 total priority ordering",
  reviewer =     "Erol Gelenbe",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Gaver:1976:EAA,
  author =       "D. P. Gaver and S. S. Lavenberg and T. G. {Price,
                 Jr.}",
  title =        "Exploratory Analysis of Access Path Length Data for a
                 Data Base Management System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "449--464",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "IMS (Information Management System) when the
                 collection of data analyzed is a sequence of access
                 path lengths for a day-long period. The number of
                 segments accessed by searching a data base in order to
                 retrieve a specified segment for a user is called an
                 access path length. Part of the motivation for the
                 analysis is to suggest reasonable stochastic models for
                 the access path length sequence that can be
                 conveniently utilized as input models for a stimulation
                 model of an IMS installation. The exploratory approach
                 taken to the data involves the use of graphical
                 displays and simple numerical summaries to reveal
                 characteristics of, and patterns in, the data.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C7100 (Business and
                 administration)",
  classification = "723; 922",
  corpsource =   "Naval Postgraduate School, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access path length; data base management system; data
                 base systems; data processing --- Critical Path
                 Analysis; data structure; data structures; database
                 management systems; exploratory analysis; graphical
                 displays; information retrieval systems ---
                 Mathematical Models; input; model; models; numerical
                 summaries; probability --- Random Processes;
                 stochastic",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lewis:1976:SAN,
  author =       "P. A. W. Lewis and G. S. Shedler",
  title =        "Statistical Analysis of Non-Stationary Series of
                 Events in a Data Base System",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "465--482",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "56 \#1662",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes methods, both old and new, for
                 the statistical analysis of non-stationary univariate
                 stochastic point processes and sequences of positive
                 random variables. Such processes are frequently
                 encountered in computer systems. As an illustration of
                 the methodology an analysis is given of the stochastic
                 point process of transactions initiated in a running
                 data base system. On the basis of the statistical
                 analysis, a non-homogeneous Poisson process model for
                 the transaction initiation process is postulated for
                 periods of high system activity and found to be an
                 adequate characterization of the data.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140Z (Other topics in statistics); C6120 (File
                 organisation); C6150G (Diagnostic, testing, debugging
                 and evaluating systems)",
  classification = "723; 922",
  corpsource =   "Naval Postgraduate School, Monterey, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; clustering; data base subsystem models; data
                 base systems; database management systems; methodology;
                 nonstationary series; performance evaluation;
                 probability --- Random Processes; process; program
                 testing; statistical; statistical analysis; stochastic
                 processes; transaction initiation; workload",
  reviewer =     "E. C. Posner",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lum:1976:GMD,
  author =       "V. Y. Lum and N. C. Shu and B. C. Housel",
  title =        "A General Methodology for Data Conversion and
                 Restructuring",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "483--497",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "While the use of data base systems relieves users of
                 the task of having to know much of the implementation
                 details, it has at the same time made data conversion a
                 necessity for various reasons. The model for data
                 conversion presented assumes that both source and
                 target systems are available and that conversion
                 interfaces may be required to interact between these
                 systems and the conversion system. To achieve data
                 conversion or translation using this approach, two
                 languages are needed: a language to describe the data
                 structures, and a language to specify the mapping
                 between source and target data. This paper describes
                 these two languages, DEFINE and CONVERT and gives
                 numerous examples to show how they can be used in data
                 conversion and restructuring.",
  acknowledgement = ack-nhfb,
  annote =       "Translated by changing to a `Linear' format. Worked on
                 the correspondence of this to relational format. Two
                 languages, one defines the Schema, the other converts
                 between schemas that have these descriptions
                 attached.",
  classcodes =   "C6120 (File organisation); C6140E (Other programming
                 languages)",
  classification = "723",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data; data base
                 systems; data checking; data conversion; data
                 description; data processing --- Data Structures; data
                 restructuring; data structures; languages; mapping;
                 methodology; model; programming languages; structures",
  owner =        "curtis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Nussbaumer:1976:DFU,
  author =       "H. J. Nussbaumer",
  title =        "Digital Filtering Using Complex {Mersenne}
                 Transforms",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "498--504",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94-04",
  MRnumber =     "54 \#7091",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Complex Mersenne Transforms are defined in a ring of
                 integers modulo a Mersenne or pseudo-Mersenne number
                 and can be computed without multiplications. It is
                 shown that under certain conditions, these transforms
                 can be computed by means of fast transform algorithms
                 and permit the evaluation of digital convolutions with
                 better efficiency and accuracy than does the Fast
                 Fourier Transform.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0230 (Integral transforms); B0290Z (Other numerical
                 methods)B1270F (Digital filters); C1130 (Integral
                 transforms)C5240 (Digital filters)",
  classification = "713; 716; 921",
  corpsource =   "IBM Centre d'Etudes et Recherches, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accuracy; Complex Mersenne Transforms; digital
                 convolutions; digital filters; efficiency; electric
                 filters, digital; fast transform algorithms;
                 mathematical transformations; signal processing ---
                 Digital Techniques; transforms",
  reviewer =     "Bradley W. Dickinson",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shedler:1976:DMR,
  author =       "G. S. Shedler and D. R. Slutz",
  title =        "Derivation of Miss Ratios for Merged Access Streams",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "505--517",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A99",
  MRnumber =     "57 \#8234",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An access stream is the sequence of storage accesses
                 made by an executing program; a merged stream results
                 from the multiprogramming of a number of individual
                 access streams. Assuming that LRU (least recently used)
                 miss ratio functions for individual streams are known,
                 the authors consider the problem of predicting the LRU
                 miss ratio function for merged streams. Each access
                 stream is modeled as a sequence of independent,
                 identically distributed LRU stack distances which
                 evolves in time as a Poisson process and the merged
                 stream is taken to be the superposition of these
                 processes. For an arbitrary number of such streams, a
                 closed form expression for the expected miss ratio
                 function is obtained.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723; 922",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming --- Multiprogramming;
                 data storage, digital; functions; LRU stack distances;
                 merged access streams; merging; miss ratio;
                 multiprogramming; Poisson process; probability ---
                 Random Processes; storage allocation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Tuel:1976:ABP,
  author =       "W. G. {Tuel, Jr.}",
  title =        "An analysis of buffer paging in virtual storage
                 systems",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "5",
  pages =        "518--520",
  month =        sep,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The model for buffer paging in a virtual storage
                 system presented in this brief paper explains the
                 observed sudden increase in paging activity and elapsed
                 time for a query when the specified buffer size exceeds
                 the number of page frames available. Analysis of the
                 model indicates that the total I/O activity increases
                 with increasing buffer size if the buffer is allowed to
                 page. Thus, optimum performance is achieved by reducing
                 the buffer size to fit the number of page frames
                 available. This is the strategy presently used for
                 IMS\slash 360 running under OS\slash VS.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "buffer paging; buffers; data base systems; data
                 storage, digital; exceptions; model; page; searching;
                 virtual storage; virtual storage systems",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Horton:1976:WFD,
  author =       "John W. Horton",
  title =        "{Walsh} Functions for Digital Impedance Relaying of
                 Power Lines",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "530--541",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Impedance distance relaying for fault-protection of a
                 plurality of high-voltage lines has not been
                 accomplished with a minicomputer because of the burden
                 of time placed upon these computers. A new method for
                 computing impedance from data samples is proposed,
                 which would employ only the computer operations of Add,
                 Subtract, and Shift. This is valuable because these
                 operations are one to two orders of magnitude faster on
                 present day minicomputers than the operations of
                 Multiply, Divide, Square, and Square Root. The new
                 method is based upon the use of Walsh functions. When
                 compared with the best competitive method, this new
                 method shows superiority in speed and an accuracy that
                 meets proposed objectives.",
  acknowledgement = ack-nhfb,
  classcodes =   "B8130B (Power cables); B8140 (Power system
                 protection); C7410B (Power engineering computing)",
  classification = "706; 722; 723; 731; 942",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers, digital --- Special Purpose Application;
                 control systems, digital; data samples; digital
                 relaying; electric impedance; electric measurements ---
                 Impedance; electric power systems --- Protection;
                 electrical engineering computing; fault; HV lines;
                 impedance computation; location; minicomputers; power
                 cables; power lines; protective relaying; relay
                 protection; Walsh functions",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Schweitzer:1976:BOS,
  author =       "Paul J. Schweitzer and Simon S. Lam",
  title =        "Buffer Overflow in a Store-And-Forward Network Node",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "542--550",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20 (60K30 68A99)",
  MRnumber =     "58 \#33577",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "367.60105",
  abstract =     "Equilibrium behavior of a store-and-forward network
                 node with finite buffer capacity is studied via a
                 network-of-queues model. The positive acknowledgment
                 protocol is explicitly modeled and consumes part of the
                 buffer pool. The principal results are the buffer
                 overflow probability, the mean delays, and the
                 distribution of queue lengths as functions of the
                 buffer capacity and traffic levels.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)B6210L (Computer communications); C1140C
                 (Queueing theory); C5620 (Computer networks and
                 techniques)",
  classification = "716; 718; 723; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "buffer; buffer capacity; buffer overflow probability;
                 computer networks; data communication systems; data
                 transmission; mean delays; overflow; packet switching;
                 probability --- Queueing Theory; queue lengths
                 distribution; queueing; queueing analysis; store and
                 forward network node; switching theory;
                 telecommunication traffic; theory; traffic levels",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fernandez:1976:SGT,
  author =       "Eduardo B. Fern{\'a}ndez and Tomas Lang",
  title =        "Scheduling as a Graph Transformation",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "551--559",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B35",
  MRnumber =     "58 \#20378",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "359.68039",
  abstract =     "The scheduling of a set of tasks, with precedence
                 constraints and known execution times, into a set of
                 identical processors is considered. Optimal scheduling
                 of these tasks implies utilizing a minimum number of
                 processors to satisfy a deadline, or finishing in
                 minimal time using a fixed number of processors. This
                 process can be seen as a transformation of the original
                 graph into another graph, whose precedences do not
                 violate the optimality constraints and has a unique
                 basic schedule. Analysis of this transformation
                 provides insight into the scheduling process and also
                 into the determination of lower bounds on the number of
                 processors and on time for optimal schedules.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B0250
                 (Combinatorial mathematics); C1160 (Combinatorial
                 mathematics); C1290 (Applications of systems theory)",
  classification = "722; 723; 913; 921",
  corpsource =   "Data Processing Div., IBM Sci. Center, Los Angeles,
                 CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems, digital; data processing ---
                 Optimization; graph theory; graph transformation;
                 identical processors; lower bounds; mathematical
                 techniques --- Graph Theory; precedence constraints;
                 scheduling; scheduling --- Mathematical Models; system
                 engineering",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chamberlin:1976:SUA,
  author =       "Donald D. Chamberlin and Morton M. Astrahan and Kapali
                 P. Eswaran and Patricia Priest Griffiths and Raymond A.
                 Lorie and James W. Mehl and Phyllis Reisner and
                 Bradford Warren Wade",
  title =        "{SEQUEL 2}: a Unified Approach to Data Definition,
                 Manipulation, and Control",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "560--575 (or 560--565??)",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/sqlbooks.bib",
  abstract =     "SEQUEL 2 is a relational data language that provides a
                 consistent, English keyword-oriented set of facilities
                 for query, data definition, data manipulation, and data
                 control. SEQUEL 2 may be used either as a stand-alone
                 interface for nonspecialists in data processing or as a
                 data sublanguage embedded in a host programming
                 language for use by application programmers and data
                 base administrators. This paper describes SEQUEL 2 and
                 the means by which it is coupled to a host language.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6140D (High level
                 languages); C7100 (Business and administration)",
  classification = "723",
  corpsource =   "IBM Res. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data base systems;
                 data control; data definition; data processing; data
                 processing --- Data Handling; data sublanguage;
                 database management systems; host programming language;
                 language; manipulation; problem oriented languages;
                 relational data; sequel 2; SEQUEL 2",
  treatment =    "G General Review; P Practical",
}

@Article{Wong:1976:DOM,
  author =       "Chak-Kuen Wong and Po Cheung Yue",
  title =        "Data Organization in Magnetic Bubble Lattice Files",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "576--581",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Some aspects of data organization in bubble lattice
                 files (BLF) are discussed. A self-organizing feature
                 based on Transposition Ordering is introduced to suit
                 the special requirements of BLF. This scheme can also
                 be implemented in T-I bar bubble memories without much
                 difficulty. Many variations of Transposition Ordering
                 are possible. For example, instead of interchanging
                 whole columns, only portions of columns can be
                 interchanged. On the other hand, columns can be
                 interchanged at a fixed distance as well as adjacent
                 columns. In this way, one could approximate the
                 ordering by usage frequency much more quickly through a
                 compromise between Transposition Ordering and Last Use
                 Ordering. Some performance figures are included for
                 comparison.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120L (Magnetic bubble domain devices); C5320E
                 (Storage on stationary magnetic media); C6120 (File
                 organisation)",
  classification = "721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data organization; data processing --- Data Handling;
                 data storage, digital --- Self Organizing; data
                 storage, magnetic; dynamic; file organisation; magnetic
                 bubble devices; magnetic bubble lattice files; magnetic
                 film; magnetic memory; magnetic thin film devices;
                 ordering scheme; performance figures; stores",
  treatment =    "P Practical",
}

@Article{Grossman:1976:PRT,
  author =       "David D. Grossman",
  title =        "Procedural Representation of Three-Dimensional
                 Objects",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "582--589",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A system of PL/I procedures has been written that
                 permits geometric objects to be described
                 hierarchically. The objects are themselves represented
                 as PL/I procedures, allowing very general use of
                 variables. By effectively intercepting subprogram
                 calls, the system provides a means of modifying the
                 semantics associated with any object without modifying
                 the object's procedural description.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130B (Graphics techniques)",
  classification = "723; 901",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer graphics; computer programming; computer
                 programming languages --- pl/i; engineering ---
                 Computer Aided Design; geometric objects; modelling;
                 objects representation; PL/I procedures; three
                 dimensional",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Appel:1976:DTD,
  author =       "Arthur Appel and Peter M. Will",
  title =        "Determining the Three-Dimensional Convex Hull of a
                 Polyhedron",
  journal =      j-IBM-JRD,
  volume =       "20",
  number =       "6",
  pages =        "590--601",
  month =        nov,
  year =         "1976",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method is presented for determining the
                 three-dimensional convex hull of a real object that is
                 approximated in computer storage by a polyhedron.
                 Essentially, this technique tests all point pairs of
                 the polyhedron for convex edges of the convex hull and
                 then assembles the edges into the polygonal boundaries
                 of each of the faces of the convex hull. Various
                 techniques for optimizing this process are discussed. A
                 computer program has been written, and typical output
                 shapes are illustrated. Finding the three-dimensional
                 convex hull is approximately the same computer burden
                 as eliminating hidden lines.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130B (Graphics techniques)",
  classification = "723; 901",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer graphics; computer program; computer storage;
                 dimensional convex hull; engineering --- Computer Aided
                 Design; image processing; pattern recognition systems
                 --- Optimization; polyhedron; three",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Buehner:1977:AIJ,
  author =       "W. L. Buehner and J. D. Hill and T. H. Williams and J.
                 W. Woods",
  title =        "Application of Ink Jet Technology to a Word Processing
                 Output Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "2--9",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a word processing system output
                 printer that uses the electrostatic synchronous ink jet
                 printing process. An overview of the ink jet matrix
                 printing process is provided, as well as brief
                 descriptions of the elements of the printer. Printer
                 performance objectives are outlined, and some of the
                 design problems encountered during development are
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices); B8660 (Power
                 applications in printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "631; 722; 745; 804",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment --- Printers; design;
                 development; electrostatic devices; electrostatic
                 synchronous; flow of fluids --- Jets; ink; ink jet
                 printing; ink jet printing process; ink jets;
                 performance; printers; printing; text editing; word
                 processing output printer",
  treatment =    "A Application",
}

@Article{Curry:1977:SMI,
  author =       "S. A. Curry and H. Portig",
  title =        "Scale Model of an Ink Jet",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "10--20",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A scale model, approximately fifty times the size of
                 its prototype, was used to study drop formation of an
                 ink jet. Viscosity, surface tension, and inertial
                 forces were modeled; gravity and air drag forces were
                 not. The model accurately predicted operating
                 conditions leading to the formation of undesirable
                 satellite drops, thus permitting evaluation of measures
                 designed to avoid them.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "631; 722; 745; 804; 931",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment --- Printers; drop
                 formation; drops; flow of fluids --- Jets; inertial
                 forces; ink; ink jet; ink jets; jets; liquids --- Drop
                 Formation; operating conditions; printers; printing;
                 satellite drops; scale model; surface tension",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pimbley:1977:SDF,
  author =       "W. T. Pimbley and H. C. Lee",
  title =        "Satellite Droplet Formation in a Liquid Jet",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "21--30",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The formation and behavior of satellite droplets in a
                 liquid jet is investigated experimentally and
                 theoretically. The satellite droplet break-off distance
                 is measured stroboscopically as a function of the
                 frequency and amplitude of nozzle vibration. A
                 second-order analysis of spatial instability is
                 developed, which demonstrates the essential features of
                 satellite formation as it is observed. Satellite
                 formation is least likely to occur when the main-drop
                 spacing is five to seven times the jet diameter.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM System Communications Div. Lab., Endicott, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "breakoff distance; droplet formation; drops; flow
                 instability; flow of fluids --- Jets; ink; ink jets;
                 jets; liquid jet; liquids; nozzle; printers; printing
                 --- Electrostatic; satellite droplets; spatial
                 instability; vibration",
  treatment =    "P Practical",
}

@Article{Twardeck:1977:EPV,
  author =       "T. G. Twardeck",
  title =        "Effect of Parameter Variations on Drop Placement in an
                 Electrostatic Ink Jet Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "31--36",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses the sensitivity of drop-to-drop
                 spacing in the print plane of an ink jet printer to
                 other printer variables. Two designed experiments, a
                 fractional factorial and a central composite, combined
                 with standard analysis identified the critical
                 variables and provided a mathematical expression useful
                 for setting tolerances.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices); B8660 (Power
                 applications in printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "631; 745; 804; 921; 931",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; critical variables; drop placement; drops;
                 electrostatic devices; electrostatic ink jet printer;
                 flow of fluids --- Jets; ink; ink jets; jets; liquids
                 --- Drop Formation; mathematical techniques; printers;
                 printing; sensitivity; spacing; tolerances",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fillmore:1977:DCD,
  author =       "G. L. Fillmore and W. L. Buehner and D. L. West",
  title =        "Drop Charging and Deflection in an Electrostatic Ink
                 Jet Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "37--47",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Included in this discussion of drop charging are
                 induction interaction effects and charge
                 synchronization requirements, as well as design
                 considerations for the charge electrode. In describing
                 the parameters governing drop deflection, some drop
                 placement errors are related to undesired interactions
                 resulting from aerodynamic forces and electrostatic
                 repulsion effects on the drops. A scheme for obtaining
                 accurate drop placement in the presence of these
                 interaction effects is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices); B8660 (Power
                 applications in printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "631; 745; 804; 931",
  corpsource =   "IBM Office Products Div. Lab., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerodynamic forces; charge electrode; charge
                 synchronization; design; drop charging; drop
                 deflection; drop placement errors; drops; effects;
                 electrostatic devices; electrostatic ink jet printer;
                 electrostatic repulsion; flow of fluids --- Jets; ink;
                 ink jets; interaction; jets; liquids --- Drop
                 Formation; printers; printing",
  treatment =    "P Practical",
}

@Article{Lee:1977:BLA,
  author =       "H. C. Lee",
  title =        "Boundary Layer Around a Liquid Jet",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "48--51",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The phenomenon of air wake caused by a train of liquid
                 drops is studied by approximating the train to a
                 cylindrical jet emerging from a nozzle. The boundary
                 layer equations are derived by applying continuity of
                 jet mass and matching the loss of jet momentum with the
                 air drag on the jet. These equations are solved
                 numerically and compared with experiments in which the
                 velocity change of the jet along the stream is
                 carefully measured through measurements of drop
                 distances. Good agreement is obtained between
                 experimental results and the analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4715C (Laminar boundary layers); A4755C (Jets in
                 fluid dynamics); C5550 (Printers, plotters and other
                 hard-copy output devices)",
  classification = "631; 651; 931",
  corpsource =   "IBM System Communication Div. Lab., Endicott, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerodynamics --- Wakes; air drag; air wake; boundary
                 layer; boundary layers; cylindrical job; drop
                 distances; equations; flow of fluids; jets; liquid
                 drops; liquids --- Drop Formation; printers; wakes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Carmichael:1977:CPH,
  author =       "J. M. Carmichael",
  title =        "Controlling Print Height in an Ink Jet Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "52--55",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A control system is described for maintaining constant
                 print height in an ink jet printer. Following power on
                 and during a periodic off-line correction operation a
                 specially designed sensor detects the position of a
                 test group of electrostatically charged ink drops to
                 obtain print height correction data. Information
                 provided by the same sensor is used to synchronize the
                 application of a unique charge to each drop to be
                 printed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices); B8660 (Power
                 applications in printing industries); C3120C (Spatial
                 variables control); C3350L (Control applications in
                 printing and associated industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "631; 745; 804",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "constant print height; electrostatic devices;
                 electrostatically charged ink drops; flow of fluids ---
                 Jets; ink; ink jet printer; ink jets; jets; position
                 control; print height correction; printers; printing;
                 sensor",
  treatment =    "A Application; P Practical",
}

@Article{Levanoni:1977:SFF,
  author =       "M. Levanoni",
  title =        "Study of Fluid Flow Through Scaled-Up Ink Jet
                 Nozzles",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "56--68",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A 100-fold scaled-up model of ink jet nozzle flow is
                 described. A theoretical justification for scaling the
                 relevant parameters, starting from the equations of
                 motion, is presented. The scaling procedure and the
                 effects of unscaled parameters are discussed as well as
                 the scaled-up ``ink''. Following a description of the
                 experimental apparatus, the results of a series of
                 experiments are then presented. These consist of
                 directionality, directional stability and flow
                 efficiency measurements in four nozzle configurations:
                 conical, cylindrical, square, and ``hybrid'' nozzles.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); A4755E (Nozzles);
                 C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "631; 745; 804",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "conical nozzles; cylindrical nozzles; directional
                 stability; directionality; equation of motion; flow
                 efficiency; flow instability; flow of fluids; hybrid;
                 ink; ink jet nozzle flow; ink jets; jets; nozzles;
                 printers; printing --- Electrostatic; scaling; square
                 nozzles",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ashley:1977:DCI,
  author =       "C. T. Ashley and K. E. Edds and D. L. Elbert",
  title =        "Development and Characterization of Ink for an
                 Electrostatic Ink Jet Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "69--74",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The formulation logic, test procedures, failure
                 analyses and problem resolutions involved in developing
                 ink for an electrostatic ink jet printer are reviewed.
                 The variables that influence the jet printing process
                 and print quality are defined, and their relationship
                 to specific formulations is discussed. Also considered
                 are the relationships between formulation variables and
                 failure modes inherent in the ink.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0590 (Materials testing); B5180D (Electrostatic
                 devices); B8660 (Power applications in printing
                 industries); C5550 (Printers, plotters and other
                 hard-copy output devices)",
  classification = "631; 745; 804",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electrostatic devices; electrostatic ink jet printer;
                 failure analyses; failure analysis; flow of fluids ---
                 Jets; formulation logic; ink; ink characterisation; ink
                 development; ink jets; jet printing process; materials
                 testing; print; printers; printing --- Electrostatic;
                 procedures; quality; test",
  treatment =    "P Practical",
  xxtitle =      "Development and characterisation of ink for an
                 electrostatic ink jet printer",
}

@Article{Beach:1977:MSI,
  author =       "B. L. Beach and C. W. Hildenbrandt and W. H. Reed",
  title =        "Materials Selection for an Ink Jet Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "1",
  pages =        "75--80",
  month =        jan,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An ink jet printer includes a system of parts that
                 supplies, filters, pumps, circulates, and pulses a jet
                 of ink. These parts, made of various materials (metals,
                 plastics, rubbers, adhesives), must satisfy the
                 mechanical and electrical requirements of the system
                 while being compatible with the chemical composition of
                 the ink. This paper describes the selection and
                 evaluation of these materials for a particular ink and
                 printer design.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0590 (Materials testing); B8660 (Power applications
                 in printing industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "745",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chemical composition; electrical requirements; ink jet
                 printer; ink jets; materials; materials testing;
                 mechanical requirements; parts; printers; printing ---
                 Electrostatic; printing machinery; selection",
  treatment =    "P Practical",
}

@Article{Street:1977:PPS,
  author =       "G. Bryan Street and Richard L. Greene",
  title =        "Preparation and Properties of ({SN})$_x$",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "99--110",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The chain compound (SN)$_x$ is the first example of a
                 superconducting polymer. A review is given of the
                 chemistry, structure, and physical properties of
                 (SN)$_x$ and describing how the electrical properties
                 of this novel material depend upon the crystal growth
                 technique. The thermal properties of S$_2$N$_2$ and
                 (SN)$_x$ are discussed with particular reference to the
                 crystal growth process. The fibrous nature of the
                 polymer is described and evidence is presented showing
                 that interchain coupling plays a significant role in
                 determining the physical properties of this material.
                 Finally the authors summarize their attempts to prepare
                 analogous polymeric metals.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7470 (Superconducting materials); A8110B (Crystal
                 growth from vapour); B0510 (Crystal growth); B3220
                 (Superconducting materials)",
  classification = "708; 815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(SN)/sub x/; analogous polymeric metals; chain
                 compound; chemistry; crystal growth from vapour;
                 crystal growth technique; electrical; interchain
                 coupling; one-dimensional conductivity; physical
                 properties; polymers; properties; reviews; structure;
                 sulphur compounds; superconducting materials;
                 superconducting polymer; thermal properties; type II
                 superconductors",
  treatment =    "B Bibliography; G General Review",
}

@Article{Lyerla:1977:NSC,
  author =       "James R. {Lyerla, Jr.}",
  title =        "{NMR} Study of the Chain Microstructure of
                 p({MMA-Co-MAA})",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "111--120",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The usefulness of proton and carbon-13 NMR
                 spectroscopy in characterizing the chain microstructure
                 (i.e., sequence distribution and tacticity) of methyl
                 methacrylate-methacrylic acid (MMA-MAA) copolymers is
                 investigated. Because the comonomers have such similar
                 structures, assessment of chain tacticity and sequence
                 distribution required computer simulation of spectra to
                 circumvent the problems of resonance overlap. The
                 results indicate that free-radical polymerization in
                 toluene yielded a heterogeneous copolymer system while
                 free-radical polymerization in tetrahydrofuran (THF)
                 and emulsion polymerization yielded relatively
                 homogeneous systems.",
  acknowledgement = ack-nhfb,
  classification = "815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "copolymers",
}

@Article{Hiraoka:1977:RCP,
  author =       "Hiroyuki Hiraoka",
  title =        "Radiation Chemistry of Poly(Methacrylates)",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "121--130",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An experimental study comparing radiation-induced
                 degradation of poly(methacrylates) from ultraviolet,
                 gamma-ray (**6**0Co), and electron-beam irradiation is
                 presented. Analytical techniques used include mass
                 spectroscopy, low-temperature electron paramagnetic
                 resonance, and infrared spectrometry. The
                 poly(methacrylate) polymers investigated are
                 poly(methyl methacrylate) (PMMA), poly(t-butyl
                 methacrylate) (PBMA), poly(methacrylic acid) (PMA), and
                 poly(methacrylic anhydride) (PMA AN). All are shown to
                 exhibit scission of the main chains and removal of the
                 side groups when irradiated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A6180E (Gamma ray effects); A6180F (Electron
                 and positron effects); A8250 (Photochemistry and
                 radiation chemistry); B0560 (Polymers and plastics
                 (engineering materials science))B2550 (Semiconductor
                 device technology); B2550G (Lithography)",
  classification = "622; 815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "beam effects; chains scission; degradation; effects;
                 electron; electron beam effects; electron paramagnetic
                 resonance; electron resists; gamma ray effects;
                 gamma-ray effects; infrared spectrometry; main; mass
                 spectroscopy; photoresists; poly(methacrylates);
                 poly(methacrylic acid); poly(methacrylic anhydride);
                 poly(methyl methacrylate); poly(t-butyl methacrylate);
                 polymers; radiation; radiation chemistry; ultraviolet
                 radiation",
  treatment =    "X Experimental",
}

@Article{Tu:1977:MKP,
  author =       "Yih-O Tu and Augustus C. Ouano",
  title =        "Model for the Kinematics of Polymer Dissolution",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "131--142",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The dissolution of glassy polymers is described by a
                 phenomenological model of the motion of two boundaries:
                 the liquid-gel boundary and the gel-glass boundary. The
                 motion of these boundaries, as well as the
                 concentration profile in the layers of a dissolving
                 polymer, was obtained by numerical solution of the
                 Stefan boundary value problem. A potential application
                 of this model to the study of the dissolution dynamics
                 of other polymer-solvent systems is done by simulating
                 the dissolution of three types of polymer-solvent
                 pairs: (1) swelling of rubber, (2) high glass
                 transition concentration, and (3) low glass transition
                 concentration. Contrasting dissolution characteristics
                 are shown for the effect of different types of
                 polymer-solvent pairs as well as for the effect of
                 different molecular weights for the same type of
                 polymer-solvent pair.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6125H (Structure of macromolecular and polymer
                 solutions (solubility, swelling, etc.); polymer melts);
                 A6140K (Structure of polymers, elastomers, and
                 plastics); A6470P (Glass transitions); A6475
                 (Solubility, segregation, and mixing); B0560 (Polymers
                 and plastics (engineering materials science))",
  classification = "815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boundary-value problems; concentration; concentration
                 profile; dissolution dynamics; dissolution kinematics;
                 dissolving; electron resists; ethyl ketone; glass gel
                 interface; high glass transition; liquid gel interface;
                 low glass transition concentration; methyl; molecular;
                 numerical solution; polymer solutions; polymers;
                 polystyrene; rubber; Stefan boundary; swelling; value
                 problem; weights",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Gipstein:1977:PAE,
  author =       "Edward Gipstein and Augustus C. Ouano and Duane E.
                 Johnson and Omar U. {Need III}",
  title =        "Parameters Affecting the Electron Beam Sensitivity of
                 Poly(Methyl Methacrylate)",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "143--153",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Poly(methyl methacrylate), PMMA, is used as a model
                 polymer to determine quantitatively the effect of
                 molecular weight, molecular weight distribution, and
                 tacticity on electron beam sensitivity. The
                 heterotactic, syndiotactic, and isotactic stereoforms
                 of PMMA were synthesized with molecular weights ranging
                 from 10**4 to 10**7 and dispersivities from 1.2 to
                 about 10. The G-values as determined by gamma radiation
                 are about 1.3 and are independent of the three
                 parameters. The molecular size of the developer solvent
                 is shown to have a much greater effect on the
                 solubility rate than the molecular weight of the
                 resist. An optimal developer solvent for PMMA can be
                 systematically selected from a homologous series of
                 n-alkyl acetates which enhance the resist
                 sensitivity.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0560 (Polymers and plastics (engineering materials
                 science))B2550 (Semiconductor device technology);
                 B2550G (Lithography)",
  classification = "815; 932",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alkyl acetates; developer solvent; distribution;
                 electron beam; electron beam sensitivity; electron
                 beams; electron resists; G-values; heterotactic
                 poly(methyl; isotactic stereoforms; methacrylate);
                 molecular size; molecular weight; molecular weight
                 ratio; n-; PMMA; polymer; polymers; positive resists;
                 relative solubility rates; resist sensitivity;
                 sensitivity; syndiotactic poly(methyl methacrylate);
                 tacticity",
  treatment =    "A Application; X Experimental",
}

@Article{Smith:1977:SRP,
  author =       "Thor L. Smith",
  title =        "Strength and Related Properties of Elastomeric Block
                 Copolymers",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "154--167",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Stress-strain curves of single-phase noncrystallizable
                 elastomers over extended ranges of temperature and
                 extension rate are considered qualitatively along with
                 phenomenological and mechanistic aspects of fracture.
                 Data are presented to show that single-phase
                 noncrystallizable elastomers lack toughness except when
                 segmental mobility is sufficiently low so that
                 viscoelastic processes near the tip of a slowly growing
                 crack effectively retard its growth. Highly effective
                 strengthening mechanisms are imparted by plastic
                 domains which results from phase separation in
                 elastomeric block copolymers and from strain-induced
                 crystallization in certain elastomers. The stiffness,
                 tensile strength, and extensibility of a
                 poly(urea-urethane) and three polyurethane elastomers
                 over a broad temperature range are discussed in terms
                 of the type, size, and concentration of the
                 domain-forming segments.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A6220D (Elasticity, elastic constants);
                 A6220F (Deformation and plasticity); A6220M (Fatigue,
                 brittleness, fracture, and cracks); A8140J (Elasticity
                 and anelasticity); A8140L (Deformation, plasticity and
                 creep); A8140N (Fatigue, embrittlement, and fracture)",
  classification = "815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "block copolymers; crystallization; elastic constants;
                 elastomers; extensibility; fracture; mechanisms;
                 noncrystallizable elastomers; phase separation; plastic
                 domains; poly(urea urethane); polyurethane elastomers;
                 relations; stiffness; strain induced; strengthening;
                 stress strain curves; stress-strain; tensile strength",
  treatment =    "X Experimental",
}

@Article{Swalen:1977:PPT,
  author =       "Jerome D. Swalen and Randolph Santo and Maurus Tacke
                 and Josef Fischer",
  title =        "Properties of Polymeric Thin Films by Integrated
                 Optical Techniques",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "168--175",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Report on an innovative procedure for taking
                 measurements using integrated optical techniques on a
                 number of polymers fabricated into thin film form and
                 used as optical waveguides. Refractive index (including
                 anisotropy), absorption and scattering, and film
                 thickness have been determined by light guiding
                 properties. Techniques for film preparation, including
                 doctor blading, dipping, horizontal flowing, and
                 spinning, are also discussed. The polymers studied are
                 poly(methyl methacrylate), poly(vinyl-formal),
                 polyacrylonitrile, poly(vinyl alcohol), poly(vinyl
                 pyrrolidone), poly(vinyl benzoate), and polystyrene.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4280L (Optical waveguides and couplers); A4282
                 (Integrated optics); A7820D (Optical constants and
                 parameters); A7865J (Optical properties of nonmetallic
                 thin films); B0560 (Polymers and plastics (engineering
                 materials science)); B4110 (Optical materials); B4130
                 (Optical waveguides); B7320P (Optical variables
                 measurement)",
  classification = "741; 815",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "absorption; anisotropy; blading; dipping; doctor; film
                 thickness; horizontal flowing; index measurement;
                 integrated optical techniques; integrated optics;
                 integrated optics --- Applications; measurement;
                 optical films; optical variables; optical waveguides;
                 poly(methyl benzoate); poly(vinyl alcohol); poly(vinyl
                 formal); poly(vinyl methacrylate); poly(vinyl
                 pyrrolidone); polyacrylonitrile; polymer films;
                 polymers; polystyrene; refractive; refractive index;
                 scattering; spinning; thin film preparation",
  treatment =    "P Practical; X Experimental",
}

@Article{Berry:1977:SDS,
  author =       "Brian S. Berry and John R. Susko",
  title =        "Solubility and Diffusion of Sulfur in Polymeric
                 Materials",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "176--189",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Radiotracer techniques were used to study the sorption
                 of sulfur vapor by silicone and epoxy polymers and to
                 obtain information on the diffusion of sulfur in these
                 materials. Sulfur is found to enter silicone polymers
                 solely by a physical solution process which obeys
                 Henry's law. The heat of solution is large (minus 0.43
                 eV) and at room temperature the solubility coefficient
                 is at least five orders of magnitude greater than for
                 many fully gaseous solutes, a results which fits an
                 empirical rule relating the solubility coefficient of a
                 given solute to its boiling point. The rapid diffusion
                 of sulfur in silicone rubber necessitated measurements
                 of the diffusion coefficient D by a vacuum desorption
                 technique. The activation energy Q and pre-exponential
                 constant D$_0$ are found to be 0.74 eV and 4 multiplied
                 by 10**5 cm**2/s, respectively. Corresponding values
                 for the epoxy, as determined by a steady state
                 permeation method, are 1.06 eV and 3 multiplied by
                 10**5 cm**2/s. These relatively large activation
                 energies and preexponential factors are thought to
                 reflect the large size of the S$_8$ molecule.",
  acknowledgement = ack-nhfb,
  classification = "804; 815; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "polymers; sulfur --- Diffusion",
}

@Article{Washo:1977:RMS,
  author =       "Basil D. Washo",
  title =        "Rheology and Modeling of the Spin Coating Process",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "2",
  pages =        "190--198",
  month =        mar,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This study examines the spin coating process both
                 experimentally and from a fundamental point of view.
                 The analysis has produced a model and a quantitative
                 relationship between spin coating thickness and
                 pertinent material and process variables. The model
                 predicts that the simplest and most reproducible
                 results occur in a region which is independent of
                 thickness and time and is characterized by low steady
                 state radial flow on the substrate. The model also
                 includes a time-dependent term, shown to be important
                 for the region of high radial flow --- fluids of
                 relatively low viscosity and process conditions of
                 relatively high speed and\slash or long times.
                 Experimentally, Newtonian-like polyamide in iso-amyl
                 alcohol solutions is examined on large rotating
                 substrates, and measurements showed excellent
                 correlation with the model. This process has
                 applications in the electronics industry.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8160C (Surface treatment and degradation of
                 semiconductors); B0170G (General fabrication
                 techniques); B0560 (Polymers and plastics (engineering
                 materials science))",
  classification = "714",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "coating techniques; dependence; iso-amyl alcohol
                 solutions; model; non Newtonian fluids; polyamide;
                 polymer; polymer solutions; rheology; semiconductor
                 device manufacture; solutions; spin coating process;
                 spin coating thickness; substrate size",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Dill:1977:TEP,
  author =       "Frederick H. Dill and Jane M. Shaw",
  title =        "Thermal Effects on the Photoresist {AZ1350J}",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "210--218",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An experimental study is reported on the various
                 effects produced by the baking steps normally used in
                 processing positive photoresists for application in
                 microelectronics. The particular material investigated
                 is AZ1350J. The thermal effects are studied in terms of
                 a newly modified model that characterizes the exposure
                 and development processes in photoresist. The changes
                 in performance of the photoresist as a result of
                 prebake, post-exposure bake, and post-development bake
                 are discussed and are related to the parameters in the
                 model that govern exposure and development. The model
                 is derived from physical rather than chemical
                 measurements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550 (Semiconductor device technology);
                 B2550G (Lithography)",
  classification = "714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "development bake; development processes; electron
                 device manufacture; exposure; heat treatment;
                 integrated circuit technology; model; photoresists;
                 positive photoresists; post; post exposure bake;
                 prebake; thermal effects",
  treatment =    "X Experimental",
}

@Article{Shaw:1977:TAP,
  author =       "Jane M. Shaw and Margaret A. Frisch and Frederick H.
                 Dill",
  title =        "Thermal Analysis of Positive Photoresist Films by Mass
                 Spectrometry",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "219--226",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Mass spectrometry is used to monitor the effect of
                 temperature on positive photoresist and its two major
                 components, a base resin and a photoactive compound.
                 This technique is also used to identify the photolytic
                 products of photoresist by exposing it in situ to
                 ultraviolet radiation and to identify the resulting
                 volatile products when it is heated after exposure.
                 Quantitative data are obtained for the two major
                 thermal products of photoresist, and the activation
                 energy is calculated for the thermal degradation of the
                 photoactive compound.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550 (Semiconductor device technology);
                 B2550G (Lithography)",
  classification = "714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "activation energy; base resin; degradation; effect of
                 temperature; effects; electron device manufacture; mass
                 spectrometer applications; photoactive compound;
                 photolytic products; photoresists; positive
                 photoresist; products; radiation; thermal; thermal
                 products; ultraviolet radiation effects; volatile",
  treatment =    "P Practical; X Experimental",
}

@Article{DiMaria:1977:CSS,
  author =       "Donelli J. DiMaria and Patrick C. Arnett",
  title =        "Conduction Studies in Silicon Nitride: Dark Currents
                 and Photocurrents",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "227--244",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Dark conduction and photoconduction phenomena in
                 amorphous, stoichiometric Si$_3$N$_4$ films
                 incorporated into metal-silicon nitride-silicon (MNS)
                 structures are studied in detail. Results demonstrating
                 the importance of hole conduction in Si$_3$N$_4$ thin
                 films are presented. the importance of trapped space
                 charge injected from the contacts is shown in an
                 analysis of the effects of Si$_3$N$_4$ thickness and
                 the choice of gate metal on conduction. Contact effects
                 that are apparent in the current characteristics of
                 thin Si$_3$N$_4$ layers become dominated by bulk
                 conduction mechanisms as the silicon nitride film
                 increases in thickness. Optical interference effects in
                 photoconduction are used to determine the origin of
                 photocarriers.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7240 (Photoconduction and photovoltaic effects;
                 photodielectric effects); A7340Q
                 (Metal-insulator-semiconductor structures); A7360H
                 (Electronic properties of insulating thin films);
                 B2530F (Metal-insulator-semiconductor structures)",
  classification = "708; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "4/ thickness; amorphous stoichiometric Si/sub 3/N/sub
                 4/; contact; dark currents; effects; electronic
                 conduction; electronic conduction in insulating thin
                 films; films; gate metal; hole conduction; insulating;
                 insulator-semiconductor structures; metal silicon
                 nitride silicon; metal-; MNS; MnS structures; optical
                 interference effects; photoconduction;
                 photoconductivity; Si/sub 3/N/sub; silicon compounds;
                 silicon nitride; structure; thin films; trapped space
                 charge",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Herbst:1977:ASV,
  author =       "Noel M. Herbst and Chao-Ning N. Liu",
  title =        "Automatic Signature Verification Based on
                 Accelerometry",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "245--253",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The fine structure of the muscle forces that are
                 exerted during the writing of a signature is constant
                 and well defined for most people. In general, the fine
                 structure is not subject to conscious control. Based on
                 these observations, an experimental system has been
                 designed that utilizes a person's signature dynamics to
                 verify identities. The design and operational features
                 of this system are described. Experiments on 70
                 subjects during a four-week period show a 2.9 percent
                 rejection of valid signatures and a 2.1 percent
                 acceptance of forgeries. An average of 1.2 trials was
                 necessary for verification. The forgers were
                 knowledgeable about the verification technique and did
                 their best to deceive the system. The acceptance rate
                 of random forgeries, i.e., accidental matching of two
                 separate signatures, was 0.16 percent.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  classification = "715",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "accelerometry; automatic signature verification;
                 character recognition; character recognition equipment;
                 computerised pattern; computerised pattern recognition;
                 electronic crime countermeasures; equipment;
                 handwriting pressure; recognition; security of data;
                 signature dynamics",
  treatment =    "P Practical; X Experimental",
}

@Article{Maruyama:1977:DLC,
  author =       "Kyoshi Maruyama and Donald T. Tang",
  title =        "Discrete Link Capacity and Priority Assignments in
                 Communication Networks",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "254--263 (or 255--263??)",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Consideration of the problem of discrete link capacity
                 assignment in store-and-forward packet switching
                 communication networks. Our problem formulation calls
                 for minimizing the network cost while satisfying all
                 the average packet delay constraints specified for
                 different classes of packets. Heuristic algorithms
                 which give near-optimal solutions of the problem are
                 developed. A description is given of a discrete link
                 capacity assignment algorithm for networks with
                 arbitrarily defined classes of packets having
                 individual delay constraints. The problem of priority
                 assignment on different classes of packets is then
                 investigated, and an algorithm is developed which
                 assigns suboptimal priorities on classes of packets
                 based on parameters such as delay requirement, path
                 length, packet length, and packet rate.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B0260 (Optimisation
                 techniques); B6210L (Computer communications); C1140C
                 (Queueing theory); C1180 (Optimisation techniques);
                 C5620 (Computer networks and techniques)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "assignment; average packet delay constraints; CAD;
                 computer communication networks; computer networks;
                 delay requirement; discrete link capacity; discrete
                 link capacity assignments; economics; heuristic
                 algorithm; minimisation; network cost minimisation;
                 packet; packet length; packet rate; packet switching;
                 path length; priority assignment; priority queueing
                 discipline; queueing theory; store and forward packet
                 switching; suboptimal priorities; switching",
  treatment =    "A Application; E Economic; T Theoretical or
                 Mathematical",
}

@Article{Chow:1977:BPA,
  author =       "We-Min M. Chow and Lin S. Woo",
  title =        "Buffer Performance Analysis of Communication
                 Processors During Slowdown at Network Control",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "264--272",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An approximate model based on renewal theory is
                 developed for the performance analysis of communication
                 processors during Network Control program (NCP)
                 slowdown. Performance values, which include cycle
                 length, buffer utilization, and message loss, were
                 computed as functions of traffic loads and
                 user-assigned threshold values of free buffers were
                 used for slowdown control. Comparison of results
                 obtained by the approximate method with simulated
                 results shows a high degree of accuracy for the
                 approximation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "approximate model; buffer performance analysis; buffer
                 utilization; communication processors; computer
                 networks; cycle length; loads; message loss; modelling;
                 network control program; renewal theory; slowdown
                 control; traffic; user assigned threshold values",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Lang:1977:ICL,
  author =       "Tomas Lang and Eduardo B. Fern{\'a}ndez",
  title =        "Improving the Computation of Lower Bounds for Optimal
                 Schedules",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "273--280",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B25 (68A20)",
  MRnumber =     "56 \#7917",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Ways of decreasing the number of operations needed to
                 compute the lower bounds of optimal schedules, by
                 reducing the number of time intervals that must be
                 considered, are presented. The bounds apply to a system
                 of identical processors executing a partially ordered
                 set of tasks, with known execution times, using a
                 non-preemptive scheduling strategy. In one approach we
                 find that the required number of intervals depends on
                 the graph. in our other approach, which subsumes the
                 first, the number of intervals is decreased to at most
                 min left bracket D**2/2, n**2 right bracket, where D is
                 the deadline to complete the tasks and n is the number
                 of tasks. The actual number of intervals for a
                 particular graph can be considerably smaller than this
                 worst case.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6150J
                 (Operating systems)",
  classification = "723",
  corpsource =   "Computer Sci. Dept., Univ. of California, Los Angeles,
                 CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; lower bounds;
                 multiprocessing system; multiprocessing systems;
                 optimal schedules; scheduling",
  reviewer =     "Kenji Onaga",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Wong:1977:DMF,
  author =       "Chak-Kuen K. Wong and Donald T. Tang",
  title =        "Dynamic Memories with Faster Random and Sequential
                 Access",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "281--288",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "56 \#4284",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Extension of the dynamic memory proposed by A. V. Aho
                 and J. D. Ullman in two directions. Instead of a
                 shuffle permutation, block shuffles are introduced. By
                 choosing suitable block sizes, faster random and
                 sequential access may result. Another direction of
                 extension comes from the addition of a reverse cyclic
                 permutation, which results in even faster random and
                 sequential access. Analyses for both the worst and the
                 average cases are given. Generalizations to arbitrary
                 radices are also discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "arbitrary radices; block shuffles; cyclic permutation;
                 data storage, digital; digital storage; dynamic
                 memories; dynamic memory; fast; file organisation;
                 random access; reverse; sequential access",
  reviewer =     "I. Kaufmann",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Feliss:1977:CPS,
  author =       "Norbert A. Feliss and Frank E. Talke",
  title =        "Capacitance Probe Study of Rotating-Head\slash Tape
                 Interface",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "3",
  pages =        "289--293",
  month =        may,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A modified version of the capacitance probe technique
                 is used to investigate the head-tape interface in a
                 rotating head configuration. The relationship between
                 air-bearing spacing and contour design is studied as a
                 function of tape tension, head protrusion, and
                 velocity; in addition, the effect of wave dynamics on
                 flying height is examined. These results are relevant
                 to the design of magnetic recording heads.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B7310J (Impedance and
                 admittance measurement); C5320C (Storage on moving
                 magnetic media)",
  classification = "722; 752",
  corpsource =   "IBM General Products Div., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
  keywords =     "capacitance measurement; capacitance probe; data
                 storage, magnetic --- Tape Storage; equipment; head
                 protrusion; magnetic heads; magnetic recording heads;
                 magnetic tape; magnetic tape equipment; probes; tape
                 recorders; tape tension; velocity; wave dynamics",
  treatment =    "P Practical; X Experimental",
}

@Article{Gaur:1977:TAH,
  author =       "S. P. Gaur",
  title =        "Two-Dimensional Analysis of High-Voltage Power
                 Transistors",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "306--314",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The internal behavior of a typical n-p-n** minus -n**
                 plus high voltage power transistor is presented for
                 several specific steady-state operating conditions
                 obtained from a two-dimensional mathematical model.
                 Internal self-heating and avalanche multiplication
                 effects are taken into account. Poisson's equation,
                 electron and hole continuity equations, and the heat
                 flow equation are solved numerically in a
                 two-dimensional region with the input parameters of
                 device dimensions, doping profile, boundary conditions
                 for external contacts, and various material constants
                 for silicon. The collector n** minus -n** plus
                 interface is the region of high electrical and thermal
                 stress that causes second breakdown failure at
                 high-voltage and high-current operating conditions. The
                 combined effects of various high-injection levels are
                 illustrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors)",
  classification = "714",
  corpsource =   "IBM System Products Div. Lab., East Fishkill, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "-/-n/sup +/ transistor; avalanche multiplication
                 effects; bipolar transistors; continuity equations;
                 electric breakdown of solids; electrical stress; heat
                 flow equation; heating; high injection levels; high
                 voltage power transistor; internal self; n-p-n/sup;
                 Poisson's equation; power; second breakdown failure;
                 semiconductor device models; Si; thermal stress;
                 transistors; two dimensional model",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Zable:1977:SDI,
  author =       "J. L. Zable",
  title =        "Splatter During Ink Jet Printing",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "315--320",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When an ink drop traveling at relatively high velocity
                 impinges on a flat surface such as paper, part of the
                 drop breaks up into many very small droplets that are
                 deposited at other points. If these droplets are
                 relatively large, then visible splatter results.
                 Various parameters (ink properties, drop velocity, drop
                 volume, space between drops, etc.) are investigated to
                 determine their effect upon splatter and hence print
                 quality. Print samples were made while varying these
                 parameters, and the resulting print quality was
                 assessed. A simple relationship among the kinetic
                 energy of the drops, the overlap between drops, and
                 print quality based upon splatter is developed. This
                 relationship can be used to establish design boundaries
                 in an ink jet printer.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722",
  corpsource =   "IBM System Communications Div. Lab., Endicott, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; drop velocity; drop
                 volume; energy; ink jet printer; ink jet printing;
                 kinetic; print quality; printers; splatter",
  treatment =    "P Practical; X Experimental",
}

@Article{Lieberman:1977:AAP,
  author =       "L. I. Lieberman and M. A. Wesley",
  title =        "Autopass: an Automatic Programming System for Computer
                 Controlled Mechanical Assembly",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "321--333",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An experimental very high level programming system for
                 computer controlled mechanical assembly, AUTOPASS
                 (AUTOmated Parts ASsembly System) is described. The
                 AUTOPASS language is oriented toward objects and
                 assembly operations, rather than motions of mechanical
                 assembly machines. It is intended to enable the user to
                 concentrate on the overall assembly sequence and to
                 program with English-like statements using names and
                 terminology that are familiar to him. To relate
                 assembly operations to manipulator motions, the
                 AUTOPASS compiler uses an internal representation of
                 the assembly world. This representation consists of a
                 geometric data base generated prior to compilation and
                 updated during compilation; it thus represents the
                 state of the world each assembly step. The level of the
                 language has been chosen to provide a high degree of
                 assistance to the user without the system's having to
                 perform artificial intelligence type problem solving
                 operations.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6140D (High
                 level languages); C7420 (Control engineering
                 computing); C7440 (Civil and mechanical engineering
                 computing)",
  classification = "402; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "assembling; automatic programming; automatic
                 programming system; AUTOPASS; computer; computer
                 programming; control; controlled mechanical assembly;
                 industrial computer; industrial computer control;
                 industrial plants --- Automation; problem oriented
                 language; problem oriented languages; very high level
                 programming system",
  treatment =    "A Application; P Practical",
}

@Article{Nussbaumer:1977:LFT,
  author =       "H. J. Nussbaumer",
  title =        "Linear Filtering Technique for Computing {Mersenne}
                 and {Fermat} Number Transforms",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "334--339 (or 335--339??)",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "394.65043",
  abstract =     "The implementation of pseudo-Mersenne and Fermat
                 Number Transforms is discussed. It is shown that some
                 pseudo-Mersenne Transforms can be computed efficiently
                 by a linear filtering approach. This approach is
                 extended to cover the case of Fermat and pseudo-Fermat
                 Number Transforms by using a special coding scheme for
                 implementing arithmetic operations in a Fermat number
                 system.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0230 (Integral transforms); B1270F (Digital filters);
                 B6140 (Signal processing and detection); C1130
                 (Integral transforms); C5230 (Digital arithmetic
                 methods); C5240 (Digital filters)",
  classification = "723",
  corpsource =   "IBM France, Centre d'Etudes et Recherches, La Gaude,
                 France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "digital arithmetic; digital filters; Fermat number;
                 filtering and; linear filtering; Mersenne transform;
                 prediction theory; signal filtering and prediction;
                 transform; transforms",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kiwimagi:1977:WPE,
  author =       "R. Kiwimagi and L. Griffiths and R. Furtney",
  title =        "Worst-Case Pattern Evaluation of Baseband Channels",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "340--349",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A05",
  MRnumber =     "56 \#11486",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new method is presented for evaluating the
                 performance of communication systems that use
                 binary-valued signaling formats. This technique permits
                 selection of the best overall code for a particular
                 channel or, alternatively, provides a method for
                 comparing different channels that use the same
                 transmission code. Encoded waveforms at the channel
                 input are presumed to be generated by a
                 constrained-coding procedure, which ensures, for
                 example, that the resulting binary waveform has a
                 certain minimum number of transitions per unit time,
                 limited digital sum variations (DSV), among other
                 characteristics. With this method, one first determines
                 that particular sequence (within the given code
                 constraints) that produces the maximum amount of
                 intersymbol-interference when transmitted through given
                 channel. A dynamic-programming procedure is used to
                 compute this sequence. Overall channel performance is
                 evaluated by calculating the probability of error and
                 the minimum eye-pattern opening. Numerical examples
                 illustrating the procedure for a synthetic channel are
                 presented and analyzed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6210Z (Other data transmission)",
  classification = "731",
  corpsource =   "IBM General Products Div. Lab., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "baseband channels; binary transmission channels;
                 codes; communication channels; digital communication;
                 dynamic programming; error statistics; information
                 theory; interference; intersymbol; pattern evaluation;
                 performance of communication systems; probability of
                 error; synthetic channel; systems; worst case",
  reviewer =     "Harry H. Tan",
  treatment =    "N New Development; T Theoretical or Mathematical",
}

@Article{Chaitin:1977:AIT,
  author =       "G. J. Chaitin",
  title =        "Algorithmic information theory",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "350--359",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A15 (68A20)",
  MRnumber =     "56 \#15151",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240Z (Other topics in statistics); B6110
                 (Information theory); C1260 (Information theory); C4210
                 (Formal logic); C4240 (Programming and algorithm
                 theory)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm theory; algorithmic information theory;
                 functions; information theory; probability; recursive;
                 recursive function theory",
  reviewer =     "Robert P. Daley",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Maruyama:1977:HDA,
  author =       "K. Maruyama and L. Fratta and D. T. Tang",
  title =        "Heuristic Design Algorithm for Computer Communication
                 Networks with Different Classes of Packets",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "360--369",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A typical operating environment of a packet switching
                 (store-and-forward) computer communication network is
                 that it is shared by many users with different classes
                 of packets. Packets may be classified in a very general
                 fashion by types of users, messages, applications,
                 transactions, response time requirements, packet
                 parameters such as packet rate and length, and by
                 network parameters such as source-destination and path
                 length. A well-designed network must provide access and
                 performance assurance to all packet classes. This paper
                 presents a heuristic algorithm for designing such a
                 communication network. The algorithm presented contains
                 heuristic algorithms for discrete link capacity
                 assignment, priority assignment, and flow assignment
                 problems with an additional feature which allows one to
                 alter network topology interactively. Sample results
                 from applications of the overall network design are
                 also given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques); C7410F (Communications
                 computing); C7430 (Computer engineering)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; assignment; CAD; communications computing;
                 computer communication network; computer networks;
                 discrete link capacity assignment; flow assignment;
                 heuristic; packet; packet switching; priority;
                 switching",
  treatment =    "A Application",
}

@Article{Lam:1977:QNP,
  author =       "S. S. Lam",
  title =        "Queueing networks with population size constraints",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "370--378",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25",
  MRnumber =     "56 \#16836",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6210L (Computer
                 communications); C1140C (Queueing theory); C5620
                 (Computer networks and techniques)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arrivals; communication systems; computer; computer
                 networks; data communication systems; dependent lost
                 arrivals; flow control constraints; multiple routeing
                 subchains; population size constraints; queueing;
                 queueing networks; state; storage constraints; theory;
                 triggered",
  reviewer =     "Masafumi Sasaki",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Albrecht:1977:EDR,
  author =       "D. M. Albrecht and E. G. Laenen and Chua Lin",
  title =        "Experiments on the Dynamic Response of a Flexible
                 Strip to Moving Loads",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "379--383",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental findings are reported on the dynamic
                 response of a flexible strip to moving loads traveling
                 at an oblique angle to its edges. The strip is wrapped
                 under tension around a pair of supporting pressurized
                 cylinder halves. The moving loads are applied to the
                 flexible strip at the gap between the two cylinder
                 halves. A capacitance displacement transducer measures
                 the dynamic response of the strip, which is shown in
                 isometric perspective for various boundary conditions.
                 It is shown that waves on the strip created by the
                 moving loads can be eliminated by providing a
                 hydrodynamic air film support to the flexible strip in
                 the vicinity of the moving loads. Experiments
                 demonstrate that response to the loads along the edges
                 of the strip differs from that near its center, which
                 is to be expected because of the reflection of flexural
                 waves from the boundaries of the strip. These results
                 are relevant to magnetic tape recording devices.",
  acknowledgement = ack-nhfb,
  classification = "722",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic",
}

@Article{Lam:1977:EMR,
  author =       "S. S. Lam",
  title =        "An extension of {Moore}'s result for closed queuing
                 networks",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "4",
  pages =        "384--387",
  month =        jul,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25 (90B20)",
  MRnumber =     "56 \#6924",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "closed queueing network; exponential; nondistinct
                 traffic intensities; normalization constant; queueing
                 networks; queueing theory; semiclosed; servers",
  reviewer =     "Masafumi Sasaki",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lee:1977:AMC,
  author =       "Hsing-San S. Lee",
  title =        "Analysis of the merged charge memory ({MCM}) cell",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "402--414",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Description of a digital processing method applicable
                 to a synthetic aperture radar, to be carried by the
                 space shuttle or by satellites. The method uses an
                 earth-fixed coordinate system in which corrective
                 procedures are invoked to compensate for errors
                 introduced by the satellite motion, earth curvature,
                 and wavefront curvature. Among the compensations
                 discussed are those of the coordinate system, skewness,
                 roll, pitch, yaw, earth rotation, and others. The
                 application of a Fast Fourier Transform in the
                 numerical processing of the two-dimensional convolution
                 is discussed in detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570F (Other MOS integrated
                 circuits); C5320G (Semiconductor storage)",
  classification = "714; 721; 722",
  corpsource =   "IBM System Products Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cellular arrays; charge equivalent circuit;
                 charge-coupled device circuits; chip design
                 constraints; circuits; data storage, semiconductor;
                 density; dynamic potential well; equivalent; integrated
                 memory circuits; merged charge memory cell; merged
                 surface charge transistor structure; MOS dynamic RAM;
                 polysilicon electrode; random-access storage; spatial",
  treatment =    "A Application",
}

@Article{vandeLindt:1977:DTG,
  author =       "W. J. {van de Lindt}",
  title =        "Digital Technique for Generating Synthetic Aperture
                 Radar Images",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "415--432",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Description of a digital processing method applicable
                 to a synthetic aperture radar, to be carried by the
                 space shuttle or by satellites. The method uses an
                 earth-fixed coordinate system in which corrective
                 procedures are invoked to compensate for errors
                 introduced by the satellite motion, earth curvature,
                 and wavefront curvature. Among the compensations
                 discussed are those of the coordinate system, skewness,
                 roll, pitch, yaw, earth rotation, and others. The
                 application of a Fast Fourier transform in the
                 numerical processing of the two-dimensional convolution
                 is discussed in detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); B6310 (Radar
                 theory)",
  classification = "716; 723",
  corpsource =   "IBM Federal Systems Div., Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace instrumentation; compensations; coordinate
                 system; corrective procedures; data processing ---
                 Applications; digital processing method; Earth fixed;
                 error compensation; fast Fourier; fast Fourier
                 transform; picture processing; radar; radar displays;
                 satellites; signal processing --- Digital Techniques;
                 space shuttle; synthetic aperture radar images;
                 transforms",
  treatment =    "A Application",
}

@Article{Gaur:1977:SOA,
  author =       "Santosh P. Gaur",
  title =        "Safe Operating Area for Bipolar Transistors",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "433--442",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A mathematical model is utilized to predict the safe
                 operating area (SOA) for proper circuit applications of
                 bipolar transistors in the forward as well as reverse
                 operating regions. Nonuniformity of the temperature
                 within the transistor structure due to internal
                 self-heating and the avalanche multiplication effect in
                 the reverse operating region, which cause second
                 breakdown failure, are taken into account. Steady-state
                 electrical and time-dependent thermal problems are
                 solved to establish stability of a specified operating
                 condition. Safe operating area curves for three
                 transistor designs of similar power handling capability
                 are presented. Current density and temperature
                 distributions within the transistor structure for
                 various operating conditions in the stable as well as
                 unstable regions are presented. suitability of $V_BE$
                 to estimate peak temperature within the device is
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors)",
  classification = "714",
  corpsource =   "IBM System Products Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "area; avalanche multiplication effect; bipolar
                 transistors; current density; current density
                 distributions; device models; failure; internal;
                 mathematical model; safe operating; safety; second
                 breakdown; selfheating; semiconductor; stability;
                 temperature distribution; temperature distributions;
                 transistors, bipolar",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kou:1977:MBP,
  author =       "Lawrence T. Kou and George Markowsky",
  title =        "Multidimensional Bin Packing Algorithms",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "443--448",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A10",
  MRnumber =     "56 \#13764",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A comparative study is made of algorithms for a
                 general multidimensional problem involving the packing
                 of k-part objects in k compartments in a large supply
                 of bins. The goal is to pack the objects using a
                 minimum number of bins. The properties and limitations
                 of the algorithms are discussed, including
                 k-dimensional analogs of some popular one-dimensional
                 algorithms. An application of the algorithms is the
                 design of computer networks.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1180 (Optimisation techniques); C7430 (Computer
                 engineering)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bin packing algorithms; compartments; computer
                 networks; design of computer networks; general
                 multidimensional problem; integer programming;
                 mathematical programming; minimisation; network
                 synthesis",
  reviewer =     "Frank K. Hwang",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Peters:1977:ZON,
  author =       "Robert J. Peters",
  title =        "Zero Order and Nonzero Order Decision Rules in Medical
                 Diagnosis",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "449--460 (or 449--450??)",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In searching for the optimal solution to the medical
                 diagnostic problem, it seems useful to distinguish
                 between different possible decision rules (strategies).
                 Two different classes of decision rules are considered:
                 nonzero order decision rules and constant or zero order
                 decision rules. For each class, solution methods as
                 well as heuristic approaches to finding the optimal
                 member of the class are discussed. As an exercise, the
                 diagnosis of a hematologic disease belonging to the
                 group macrocytic anemia is considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140E (Game theory); C1180 (Optimisation techniques);
                 C1290L (Systems theory applications in biology and
                 medicine)",
  classification = "416; 921",
  corpsource =   "Faculty of Economics, Univ. of Groningen, Groningen,
                 Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approaches; biomedical engineering; decision theory
                 and analysis; heuristic; mathematical programming;
                 mathematical programming --- Applications; medical
                 diagnosis; nonzero order decision rules; optimal;
                 patient diagnosis; solution; solution methods;
                 strategies; zero order decision rules",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Inselberg:1977:VGC,
  author =       "Alfred Inselberg",
  title =        "Variable Geometry Cochlear Model at Low Input
                 Frequencies: a Basis for Compensating Morphological
                 Disorders",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "461--478",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The implementation of an algorithm suitable for
                 interactive experimentation with a mathematical model
                 of the cochlea is described. In the model, the
                 cochlea's exterior shell is represented by a surface of
                 revolution. Internally, the cochlea is partitioned
                 symmetrically into two chambers (the scalae) by a
                 midplane representing the basilar membrane with its
                 bony supports together with the ``collapsed'' cochlear
                 duct (third chamber). The two chambers are filled with
                 a viscous and incompressible fluid and communicate
                 through a small opening (the helicotrema), at the
                 cochlea's apex. the system is driven by the piston-like
                 movement with frequency omega of the stapes at the
                 cochlea's basal end. An isotropic sectorial plate
                 widening toward the apex represents the basilar
                 membrane. Some of the effects of the cochlear duct are
                 considered through a provision for nonzero net pressure
                 at the basilar membrane's apical end.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8720E (Natural and artificial biomembranes); A8734
                 (Audition); C1290L (Systems theory applications in
                 biology and medicine)",
  classification = "461; 921",
  corpsource =   "IBM Los Angeles Sci. Center, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; basilar membrane; biomedical engineering;
                 biomembranes; chambers; cochlear model; ear; isotropic
                 sectorial; LF; midplane; morphological disorders;
                 physiological models; plate",
}

@Article{Fleischer:1977:LSI,
  author =       "John M. Fleischer and Milton R. Latta and Melbourne E.
                 Rabedeau",
  title =        "Laser-Optical System of the {IBM 3800} Printer",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "479--483",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A helium-neon laser, acousto-optical modulator and
                 rotating polygonal mirror are used for the optical
                 design of a computer printout system. This combination
                 of technologies in the printer produces high-quality
                 nonimpact printing at speeds of 23,000 to 52,000
                 characters per second. a new technique utilizing a
                 cylindrical\slash toroidal lens pair is described which
                 reduces, by two orders of magnitude, scan line
                 displacement errors produced by the polygonal mirror.
                 The optical design principles and alignment techniques
                 used in the assembly are shown.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 744",
  corpsource =   "General Products Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acousto-optical devices; alignment techniques;
                 applications; aspherical lenses; computer peripheral
                 equipment; computer printout; cylindrical/toroidal lens
                 pair; laser beam; lasers --- Applications; mirrors;
                 nonimpact printing; optical design; optical modulation;
                 optical systems; printers; rotating polygonal mirror;
                 scan line displacement errors; system",
  treatment =    "P Practical",
}

@Article{Delobel:1977:CDD,
  author =       "C. Delobel and R. G. Casey and P. A. Bernstein",
  title =        "Comment on: {``Decomposition of a data base and the
                 theory of Boolean switching functions''} {(IBM J. Res.
                 Develop. {\bf 17} (1973), 374--386) by Delobel and
                 Casey}",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "5",
  pages =        "484--485",
  month =        sep,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A20",
  MRnumber =     "57 \#19121",
  bibdate =      "Mon Feb 12 08:07:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Delobel:1973:DDB}.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4230 (Switching theory); C6120 (File organisation)",
  corpsource =   "Univ. of Grenoble, Grenoble, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Boolean; Boolean functions; convection; data base
                 decomposition; database management systems; functional
                 dependencies; functions; third normal form",
  reviewer =     "J. C. Muzio",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Davis:1977:ARE,
  author =       "D. E. Davis and R. D. Moore and M. C. Williams and O.
                 C. Woodard",
  title =        "Automatic Registration in an Electron-Beam
                 Lithographic System",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "498--505",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A description is given of pattern registration, a
                 process by which the circuit patterns required at a
                 particular level of device fabrication are mapped to
                 those of the preceding level. The considerations taken
                 as basic in designing an accurate, high-speed
                 registration process for a production-type
                 electron-beam exposure system are discussed. This
                 automatic registration system operates in 150
                 milliseconds per integrated circuit chip, allowing the
                 system to achieve a throughput of 2000 5-mm chips per
                 hour with overlay error of less than 0.75 $\mu$ m (3
                 sigma). The operation of this system, its performance
                 characteristics, and measurements of its
                 pattern-matching accuracy are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits); C3355 (Control applications in
                 manufacturing processes)",
  classification = "713; 745; 932",
  corpsource =   "IBM Systems Products Div. Lab., East Fishkill,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic registration system; circuit technology;
                 electron beam applications; electron beams ---
                 Applications; electron resists; integrated; integrated
                 circuit manufacture; lithography --- Applications;
                 manufacturing processes; pattern registration process;
                 photolithography",
  treatment =    "P Practical",
}

@Article{Engelke:1977:CND,
  author =       "H. Engelke and J. F. Loughran and M. S. Michail and P.
                 M. Ryan",
  title =        "Correction of Nonlinear Deflection Distortion in a
                 Direct Exposure Electron-Beam System",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "506--513",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A distortion correction technique is described, used
                 in a high-throughput electron-beam lithography exposure
                 system, which achieves an absolute deflection accuracy
                 of about 30 parts per million (ppm) throughout a 5-mm
                 field. To accomplish this, a cyclic, numerically
                 controlled magnetic deflection with an accuracy of
                 about 1000 ppm and high repeatability is first
                 established. Horizontal and vertical errors in this
                 deflection are measured by sensing the apparent
                 locations of features in a calibration grid that is
                 placed in the exposure field of the beam. The measured
                 error is smoothed by means of a two-dimensional
                 spline-fitting method, and the parameters for the
                 correction surfaces are calculated. Corrections to
                 position and speed, defined by a set of digital tables,
                 are superimposed on the basic deflection, and the
                 process is iterated until acceptable precision is
                 achieved. Parameters relating registration scans to
                 field-writing scans are then calculated for use in the
                 registration of all written fields.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits); C3355 (Control applications in
                 manufacturing processes)",
  classification = "713; 715; 932",
  corpsource =   "IBM Deutschland, Sindelfingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit technology; control; distortion correction
                 technique; electron beam applications; electron beam
                 exposure system; electron beams --- Applications;
                 electron resists; integrated; integrated circuit
                 manufacture; lithography --- Applications; magnetic
                 deflection; manufacturing processes; numerical;
                 numerical control",
  treatment =    "P Practical",
}

@Article{Mauer:1977:EOE,
  author =       "J. L. Mauer and H. C. Pfeiffer and W. Stickel",
  title =        "Electron Optics of an Electron-Beam Lithographic
                 System",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "514--521",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The electron optics of a practical scanning
                 electron-beam lithographic system (EL1) that provides
                 high-volume direct wafer exposure is described. The
                 throughput limitation inherent in serial exposure is
                 greatly reduced by exposing entire pattern segments
                 with a shaped beam. The shaped-beam concept represents
                 a combination of scanning and projection methods.
                 Twenty-five image points are exposed simultaneously to
                 increase the spot current accordingly over that of a
                 Gaussian round-beam system that exposes one image point
                 at a time. The higher total current could lead to
                 intensified Coulomb interaction between beam electrons,
                 causing excessive Boersch effect and additional
                 aberrations. However, the imaging and deflection
                 methods described here are shown, by theoretical and
                 experimental means, to reduce both the effects of
                 Coulomb interaction and the total aberration of the
                 system. This results in improvement of the beam current
                 and field coverage compared with those found in
                 conventional systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits)",
  classification = "711; 713; 745; 932",
  corpsource =   "IBM Systems Products Div. Lab., East Fishkill,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aberrations; Boersch effect; Coulomb; deflection
                 methods; direct wafer exposure; electron; electron beam
                 applications; electron beams --- Applications; electron
                 optics; imaging; integrated circuit manufacture;
                 integrated circuit technology; interaction;
                 lithographic; lithography --- Applications; resists;
                 shaped beam; system",
  treatment =    "P Practical",
}

@Article{Davies:1977:CMP,
  author =       "J. E. Davies",
  title =        "Control of Magnetic Properties During the Processing
                 of Single Crystal Garnet Films",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "522--527",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Thin single-crystal rare earth iron garnet films are
                 currently the most attractive materials for magnetic
                 bubble domain applications. To utilize their potential,
                 tight control of the magnetic properties is needed at
                 each of the film processing steps. Such steps include
                 the growth of large-area films from a supersaturated
                 PbO-B$_2$O$_3$ fluxed melt, the phosphoric acid
                 trimming of as-grown films to adjust the bubble
                 collapse field, ion implantation of the film surface to
                 suppress the formation of hard bubbles and the
                 subsequent annealing the implanted layer receives
                 during the thermal cycling of the device fabrication
                 steps. Control of film properties at each of these
                 stages will be discussed and data presented to show how
                 each of these stages may be optimized.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A7550G (Ferrimagnetics); A7570K (Domain structure in
                 magnetic films (magnetic bubbles)); A8110D (Crystal
                 growth from solution); A8115L (Deposition from liquid
                 phases (melts and solutions)); A8140E (Cold working,
                 work hardening; post-deformation annealing, recovery
                 and recrystallisation; textures); B0510D (Epitaxial
                 growth); B3110E (Ferrites and garnets); B3120L
                 (Magnetic bubble domain devices)",
  classification = "701; 708",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealing; bubble collapse field; cycling; epitaxial
                 layers; film growth; films --- Magnetic Properties;
                 garnet film; garnets; ion implantation; liquid; liquid
                 phase epitaxial growth; magnetic; magnetic annealing;
                 magnetic bubble devices; magnetic bubble domain
                 devices; PbO-B/sub 2/O/sub 3/ fluxed melt; phase
                 epitaxial growth; phosphoric acid; thermal; thin single
                 crystal rare earth Fe; trimming",
  treatment =    "P Practical",
}

@Article{Bennett:1977:PCA,
  author =       "B. T. Bennett and P. A. Franaszek",
  title =        "Permutation Clustering: an Approach to On-Line
                 Storage Reorganization",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "528--533",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "366.68019",
  abstract =     "A class of dynamic reorganization algorithms is
                 described which embodies a number of desirable systems
                 properties. Experiments on a trace taken from a large
                 data base application indicate that a member of this
                 class may be used to obtain time-varying or quasistatic
                 organizations that exhibit improved paging
                 performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer programming ---
                 Subroutines; dynamic reorganization algorithms;
                 executive programs; file organisation; online storage
                 reorganisation; organisations; organizations; paging
                 performance; permutation clustering; quasistatic;
                 storage allocation; supervisory and; supervisory and
                 executive programs; time varying; virtual storage",
  treatment =    "P Practical; X Experimental",
}

@Article{Fagin:1977:FDR,
  author =       "R. Fagin",
  title =        "Functional dependencies in a relational database and
                 propositional logic",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "534--544",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "58 \#8578",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C6120 (File organisation)",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data structures; formal logic; functional dependency
                 statements; implicational statements; proof;
                 propositional logic; relational database; semantic
                 proof; syntactic",
  reviewer =     "Clement T. Yu",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Lavenberg:1977:SSR,
  author =       "S. S. Lavenberg and C. H. Sauer",
  title =        "Sequential stopping rules for the regenerative method
                 of simulation",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "545--558",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K30 (68A55)",
  MRnumber =     "57 \#14192",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140C (Queueing theory); C1140Z (Other topics in
                 statistics)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "confidence intervals; estimation; queueing systems;
                 queueing theory; regenerative simulation; regenerative
                 stochastic structure; sequential stopping rules;
                 simulation; stochastic systems",
  reviewer =     "Laurence L. George",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lomet:1977:DFA,
  author =       "D. B. Lomet",
  title =        "Data flow analysis in the presence of procedure
                 calls",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "559--571",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "366.68020",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6150C
                 (Compilers, interpreters and other processors)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; argument parameter aliasing; calling
                 interactions; combinatorial explosion of aliasing
                 computations; data flow; multiple procedures; program
                 compilers; programming theory; recursive procedures",
}

@Article{Traub:1977:PSN,
  author =       "R. D. Traub and J. P. Roth",
  title =        "Potential significance to neurophysiology of design
                 algorithms for digital computers",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "572--575",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290L (Systems theory applications in biology and
                 medicine); C7330 (Biology and medical computing)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "brain models; digital simulation; feedback; loops;
                 medical computing; nervous system; nets; neural;
                 neurophysiology; regular design; switching circuit",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Matino:1977:ESB,
  author =       "H. Matino and T. Ushiroda",
  title =        "Effect of Substrate Bias on Properties of
                 {RF}-sputtered {CR-SiO} Films",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "576--579",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Properties of rf-sputtered Cr-SiO cermet films have
                 been studied as a function of RF substrate bias. Films
                 with five orders-of-magnitude change in electrical
                 resistivity have been deposited from one Cr-SiO(50:50
                 wt \%) target by changing the substrate bias.
                 Resistivities of about 200 OMEGA multiplied by (times)
                 cm at 5\% bias and about 2 multiplied by 10** minus **3
                 OMEGA multiplied by (times) cm at 20\% bias have been
                 obtained.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7360 (Electronic properties of thin films); A8115C
                 (Deposition by sputtering); B0520F (Vapour
                 deposition)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cermet films; cermets; Cr-SiO cermet films; electrical
                 conductivity of solids; electrical resistivity; films;
                 radiofrequency; radiofrequency sputtering; sputtered
                 coatings; sputtering; substrate bias",
  treatment =    "X Experimental",
}

@Article{Cuomo:1977:OEN,
  author =       "J. J. Cuomo and R. J. Gambino and J. M. E. Harper and
                 J. D. Kuptsis",
  title =        "Origin and Effects of Negative Ions in the Sputtering
                 of Intermetallic Compounds",
  journal =      j-IBM-JRD,
  volume =       "21",
  number =       "6",
  pages =        "580--583",
  month =        nov,
  year =         "1977",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An unexpected etching phenomenon during the sputtering
                 of rare earth-gold alloys has been found to be caused
                 by a large flux of negative gold ions from the
                 sputtering target. This effect is found to occur in a
                 range of intermetallic compounds. A model is presented
                 which predicts when negative ion formation will be
                 important. Effects of negative ions on sputter
                 deposition of thin films include reduced deposition
                 rate or substrate etching, and changes in film
                 composition and other properties. Negative ion
                 formation must also be taken into account for accurate
                 quantitative analysis by Secondary Ion Mass
                 Spectrometry (SIMS).",
  acknowledgement = ack-nhfb,
  classcodes =   "A7920N (Atom-, molecule-, and ion-surface impact);
                 A8115C (Deposition by sputtering); B0520F (Vapour
                 deposition)",
  classification = "531; 539; 547",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Au alloys; deposition rate; etching phenomenon; film
                 composition; films --- Metallic; gold alloys;
                 intermetallics; metallic thin films; model; negative
                 ions formation; radiofrequency sputtering; rare earth
                 alloys; secondary ion mass spectrometry; sputtering;
                 substrate etching; thin films",
  treatment =    "X Experimental",
}

@Article{Findley:1978:CIP,
  author =       "G. I. Findley and D. P. Leabo and A. C. Slutman",
  title =        "Control of the {IBM 3800} Printing Subsystem",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "2--12",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The IBM 3800 Printing Subsystem is controlled by a
                 high-speed multilevel, interrupt-driven microprocessor.
                 The design of this system has included several
                 innovative concepts to take advantage of the
                 flexibility of electrophotographic laser printing. New
                 functions that are introduced include intermixed
                 pitches, fonts, and line spacings; user-alterable
                 character sets; on-line forms generation; and superior
                 retry, fail-soft and diagnostic capabilities.
                 Compatibility with the operational characteristics of
                 IBM 1403 and 3211 printers is maintained. This paper
                 discusses many of the objectives, development
                 tradeoffs, and resultant control implementations for an
                 on-line computer output printing subsystem.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3370Z (Other control applications in
                 telecommunications); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "722",
  corpsource =   "General Products Div. Lab., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "capabilities; character sets; computer output printing
                 subsystem; computer peripheral equipment; computerised
                 control; design; development; diagnostic;
                 electrophotographic laser printing; electrophotography;
                 flexibility; fonts; forms generation; IBM 3800 Printing
                 Subsystem; interrupt driven microprocessor; laser beam
                 applications; line; multilevel; operational
                 characteristics; pitches; printers; retry capabilities;
                 spacings; tradeoffs",
  treatment =    "A Application",
}

@Article{Svendsen:1978:PPO,
  author =       "R. G. Svendsen",
  title =        "Paper Path of an On-Line Computer-Output Printer",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "13--18",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper describes the development of a
                 paper-handling system designed to move paper at a speed
                 of 81 cm/s in the IBM 3800 Printing Subsystem. During
                 the development of the printer a number of unique
                 problems arose from the interaction among paperline
                 components. The various approaches and solutions to
                 these problems, including paper path alignment,
                 character stretch, registration within the fuser, and
                 path error detection, are discussed and illustrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722",
  corpsource =   "General Products Div. Lab., IBM San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "character; computer peripheral equipment; development;
                 error detection; IBM 3800 Printing Subsystem;
                 interaction among; materials handling; paper; paper
                 handling; paper path alignment; paperline components;
                 path error detection; printers; registration; stretch;
                 system",
  treatment =    "A Application",
}

@Article{Cameron:1978:PSD,
  author =       "T. J. Cameron and M. H. Dost",
  title =        "Paper Servo Design for a High Speed Printer Using
                 Simulation",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "19--25",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design of feedback systems for control of paper
                 motion through the IBM Printing 3800 Subsystem is
                 described. The main tool for analysis and optimization
                 is DSL, a digital simulation language for systems of
                 continuous nature. The several stages in the evolution
                 of the design are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3120C (Spatial variables control); C3370Z (Other
                 control applications in telecommunications); C5550
                 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 723",
  corpsource =   "General Products Div. Lab., IBM San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; computer programming
                 languages; computer simulation; control of; design;
                 digital simulation; digital simulation language;
                 feedback; feedback systems; high speed printer; IBM
                 3800 Printing; optimisation; paper; paper motion;
                 position control; printers; servomechanisms;
                 Subsystem",
  treatment =    "A Application",
}

@Article{Brooms:1978:DFS,
  author =       "K. D. Brooms",
  title =        "Design of the Fusing System for an Electrophotographic
                 Laser Printer",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "26--71",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper discusses the development and design of the
                 fusing system used in the IBM 3800 Printing Subsystem.
                 The design solutions provide satisfactory fusing of
                 powdered toner print images to paper at a processing
                 rate of 81 cm/s under a variety of operating
                 conditions.",
  acknowledgement = ack-nhfb,
  classification = "722; 744",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; laser beams ---
                 Applications",
  xxnote =       "Check pages: overlap with \cite{Vahtra:1978:EPH}.",
}

@Article{Vahtra:1978:EPH,
  author =       "U. Vahtra and R. F. Wolter",
  title =        "Electrophotographic process in a high speed printer",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "34--39",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  corpsource =   "General Products Div. Lab., IBM San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer; design; electrophotographic;
                 electrophotography; hard copy; high speed printer; IBM
                 3800 Printing Subsystem; photographic process;
                 printers; process; system output printing",
  treatment =    "A Application",
  xxnote =       "Check pages: overlap with \cite{Brooms:1978:DFS}.",
}

@Article{Chu:1978:LSS,
  author =       "W. H. Chu and J. T. Jacobs",
  title =        "Light scattering study of structures in a smectic
                 liquid crystal",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "40--50",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6130E (Experimental determinations of smectic,
                 nematic, cholesteric, and lyotropic structures); A6470M
                 (Transitions in liquid crystals); A7835 (Brillouin and
                 Rayleigh scattering (condensed matter))",
  corpsource =   "Res. Div. Lab., IBM San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cooling rate; crystalline polymers; degree of
                 disorder; density fluctuations; light scattering;
                 liquid crystal phase transformations; orientation
                 fluctuations; rodlike; sample thickness; smectic liquid
                 crystal; smectic liquid crystals; spherulites;
                 structural order; structures; superstructures; surface
                 treatment",
  treatment =    "X Experimental",
}

@Article{Cox:1978:PEL,
  author =       "R. J. Cox and J. F. Johnson",
  title =        "Phase equilibria in liquid crystal mixtures",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "51--59",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6130 (Liquid crystals); A6470M (Transitions in liquid
                 crystals)",
  corpsource =   "Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; ascending solid; differential thermal;
                 equilibrium; heat of transformation; liquid crystal
                 mixtures; liquid crystal phase; mixtures; mixtures of
                 nonmesomorphic compounds; optical microscopy; phase;
                 phase equilibria; polarized light microscopy;
                 solutions; thermal analysis; thermodynamic
                 relationships; transformations; transition
                 temperatures",
  treatment =    "T Theoretical or Mathematical",
}

@Article{West:1978:AVC,
  author =       "C. H. West and P. Zafiropulo",
  title =        "Automated Validation of a Communications Protocol: The
                 {CCITT X.21} Recommendations",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "60--71",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210Z (Other data transmission); C5610 (Computer
                 interfaces)",
  corpsource =   "Zurich Res. Div. Lab., IBM Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automated communications protocol validation; call
                 establishment procedure; CCITT; computer interfaces;
                 data communication systems; interface; standardisation;
                 state diagram; X.21 interface",
  treatment =    "A Application; G General Review",
}

@Article{Michaelson:1978:RBA,
  author =       "H. G. Michaelson",
  title =        "Relation Between an Atomic Electronegativity Scale and
                 the Work Function",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "72--80",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recently compiled data for the first electron affinity
                 and the first ionization potential are used to obtain
                 values for an atomic electronegativity scale, based on
                 the Mulliken relation. From this scale and a new
                 compilation of work function data, a linear equation is
                 obtained which includes a parameter for any given
                 element, depending on its subgroup in the periodic
                 table. Data are plotted for 51 elements, including
                 simple metals, transition metals, and semiconductors.
                 These data fit the straight-line equation better than
                 10 percent. Data for the transition metals deviate
                 within the same limits as those for elements having
                 simpler electronic configurations. The
                 electronegativity scale differs significantly from the
                 Pauling scale and is shown to be a useful guide to
                 preferred values of the work function for elements.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3510H (Atomic ionization potentials, electron
                 affinities); A7330 (Surface double layers, Schottky
                 barriers, and work functions)",
  classification = "931",
  corpsource =   "Corporate Headquarters, IBM Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atomic; atomic electronegativity; electron affinity;
                 electronegativity; electronegativity scale; first
                 electron affinity; first ionization potential;
                 ionisation potential; linear equation; Mulliken
                 relation; physics; semiconductors; simple metals;
                 transition metals; work function",
  treatment =    "T Theoretical or Mathematical",
  xxauthor =     "H. B. Michaelson",
}

@Article{Doelman:1978:DAR,
  author =       "A. Doelman and A. R. Gregges and E. M. {Barrall II}",
  title =        "Data Acquisition and Reduction Program for
                 Thermogravimetry",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "81--89",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An on-line data acquisition system for
                 thermogravimetry using the IBM S/7 computer followed by
                 data reduction on a 360\slash 195 is described by means
                 of flow charts. The system is designed so that no
                 knowledge of programming is required to acquire,
                 display and manipulate data on an interactive graphics
                 terminal. The program not only extracts weight loss
                 data, but also computes the energies of activation, E,
                 for any selected weight loss interval by two methods,
                 i.e., tabular integral and derivative. The system is
                 demonstrated by a study of the activation energies for
                 loss of water, loss of carbon monoxide, and loss of
                 carbon dioxide during the thermal decomposition of
                 calcium oxalate monohydrate. The results are in good
                 agreement with the best literature values.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630E (Mass and density measurement); A0650D (Data
                 gathering, processing, and recording, data displays
                 including digital techniques); A8280 (Chemical analysis
                 and related physical methods of analysis); C7320
                 (Physics and chemistry computing)",
  classification = "723; 801",
  corpsource =   "IBM Nederland, Zoetermeer, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "activation energies; analysis; computerised
                 instrumentation; data; data acquisition; data
                 acquisition system; data processing; data reduction;
                 flow charts; gravimetric analysis; interactive graphics
                 terminal; interactive terminals; loss; program;
                 reduction and analysis; thermal; thermal decomposition;
                 thermogravimetry; weight",
  treatment =    "A Application",
}

@Article{Bayer:1978:IJP,
  author =       "R. G. Bayer and J. L. Sirico",
  title =        "Influence of Jet Printing Inks on Wear",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "1",
  pages =        "90--93",
  month =        jan,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper reports the results of wear tests performed
                 to determine the influence of jet printing inks on the
                 wear of several polymer-metal pairs, which were known
                 to be compatible with the inks. It is shown that these
                 inks generally tend to increase wear beyond that
                 occurring in a dry state. The principal reason for this
                 increase was concluded to be the adverse influence that
                 the inks have on the establishment of a beneficial
                 transfer film on the metal surface.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "745; 804",
  corpsource =   "Systems Products Div., IBM Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "beneficial transfer film; filled polymers; ink; jet
                 printing inks; jets; polymer/metal pairs; printers;
                 printing; wear",
}

@Article{Hovel:1978:NMD,
  author =       "H. J. Hovel",
  title =        "Novel Materials and Devices for Sunlight Concentrating
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "112--121",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Photovoltaic conversion under concentrated sunlight is
                 a highly promising technique that could make
                 solar-electric power generation economically
                 competitive with fossil fuel power generation by the
                 mid-1980s. An economic analysis has been performed
                 which demonstrates that solar cell efficiency,
                 concentrator efficiency, and concentrator cost are the
                 most important parameters in a concentrating
                 photovoltaic system; solar cell cost is only of
                 secondary importance (at least for Si solar cells). Six
                 novel structures are described, including modified
                 conventional Si cells, Ga$_{1-x}$Al$_x$As\slash GaAs
                 devices, interdigitated cells, vertical and horizontal
                 multijunction cells and ``multicolor'' devices.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8630J (Photoelectric conversion; solar cells and
                 arrays); B4250 (Photoelectric devices); B8110B (Power
                 system management, operation and economics); B8250
                 (Solar power stations and photovoltaic power systems);
                 B8420 (Solar cells and arrays)",
  classification = "657; 702",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aluminium compounds; cell efficiency; cells;
                 concentrating photovoltaic system; concentrator cost;
                 concentrator efficiency; devices; economic analysis;
                 economics; Ga/sub 1-x/Al/sub; gallium arsenide;
                 horizontal; interdigitated cells; modified conventional
                 Si cells; multicolour; multijunction cells;
                 photovoltaic conversion; power generation; Si solar;
                 silicon; solar; solar cell cost; solar cells; solar
                 electric; solar energy concentrators; solar power;
                 solar radiation; stations; sunlight concentrating
                 systems; vertical multijunction cells; x/As/GaAs
                 devices",
  treatment =    "G General Review; N New Development",
}

@Article{Halpern:1978:SRH,
  author =       "P. Halpern and K. L. Coulson",
  title =        "Solar Radiative Heating in the Presence of Aerosols",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "122--133",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A theoretical study is carried out to evaluate the
                 effects of aerosols on the shortwave flux divergence in
                 the lower troposphere (0-2 km) by using four
                 computational methods: Gauss--Seidel iteration, a
                 reference method by which all orders of scattering are
                 accounted for, and three approximations, primary
                 scattering, no-scattering and median wavelength. By
                 using these procedures, the radiative transfer equation
                 is solved for a cloudless plane parallel atmosphere of
                 infinite extent in the horizontal, but of finite extent
                 in the vertical. The Gauss--Seidel procedure is taken
                 as a standard and comparisons of the flux divergence
                 are made by using various combinations of solar zenith
                 angle, aerosol size frequency distribution and aerosol
                 refractive index. In many of the simulations the median
                 wavelength approximation gives accuracies comparable to
                 those of the no-scattering approximation, in which case
                 the choice of method is based on the required
                 computational time. However, inaccuracies appear with
                 all the approximations and the degree of superiority of
                 one method over another depends on the aerosol and
                 gaseous constituents of the model atmosphere.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0290 (Other topics in mathematical methods in
                 physics); A9265V (Clouds, fog, haze, aerosols, effects
                 of pollution)",
  classification = "657; 804; 921",
  corpsource =   "IBM Palo Alto Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerosol refractive; aerosol size frequency
                 distribution; aerosols; altitude km 0002; cloudless
                 plane parallel atmosphere; computer; digital
                 simulation; Gauss Seidel iteration; heating; index;
                 lower troposphere; mathematical techniques; medium
                 wavelength; no scattering; primary; radiative transfer;
                 radiative transfer equation; scattering; shortwave flux
                 divergence; simulation; solar radiation; solar
                 radiative heating; solar zenith angle; troposphere",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Nussbaumer:1978:CCD,
  author =       "H. J. Nussbaumer and P. Quandalle",
  title =        "Computation of convolutions and discrete {Fourier}
                 transforms by polynomial transforms",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "134--144",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D15 (65T05)",
  MRnumber =     "57 \#10997",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The calculation of two-dimensional digital
                 convolutions has many applications, particularly in
                 image processing. The main problem associated with
                 these convolutions relates to processing load required
                 for their computation. In this article discrete
                 transforms are introduced and defined in a ring of
                 polynomials. These polynomial transforms are shown to
                 have the convolution property and can be computed in
                 ordinary arithmetic, without multiplications.
                 Polynomial transforms are particularly well suited for
                 computing discrete two-dimensional convolutions with a
                 minimum number of operations. Efficient algorithms for
                 computing one-dimensional convolutions and Discrete
                 Fourier Transforms are then derived from polynomial
                 transforms.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0230 (Integral transforms); B0290Z (Other numerical
                 methods)C1130 (Integral transforms); C4190 (Other
                 numerical methods)",
  classification = "723; 741; 921",
  corpsource =   "Compagnie IBM France, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "convolutions; discrete Fourier transforms; discrete
                 two dimensional; efficient algorithms; Fourier
                 transforms; image processing; mathematical
                 transformations --- Fourier Transforms; one
                 dimensional; ordinary arithmetic; polynomial;
                 polynomials; transforms",
  reviewer =     "Y. L. Luke",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lafuente:1978:LFP,
  author =       "J. M. Lafuente and D. Gries",
  title =        "Language Facilities for Programming User-Computer
                 Dialogues",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "145--158",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Extensions to PASCAL that provide for programming
                 man-computer dialogues are proposed. An interactive
                 application program is viewed as a sequence of frames,
                 representing stages of dialogue activity, and separate
                 computational steps. First, extensions are presented to
                 allow the description of the items of information
                 contained in each frame. Second, PASCAL is extended to
                 allow the inclusion of behavior rules for a frame to
                 specify the interactive dialogue. The behavior rules
                 are specified nonprocedurally. Previously, programming
                 such dialogues has required the specification of all
                 possible interactions and their effects in a procedural
                 fashion.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6140D (High
                 level languages)",
  classification = "723",
  corpsource =   "IBM Systems Products Div. Lab., Poughkeepsie, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "behaviour rules; computer programming languages;
                 dialogue activity; frames; interactive dialogue;
                 interactive systems; language facility; man computer
                 dialogue programming; Pascal; programming; separate
                 computational; steps; user computer dialogues",
  treatment =    "P Practical",
}

@Article{Hohl:1978:VPS,
  author =       "J. H. Hohl",
  title =        "Variational Principles for Semiconductor Device
                 Modeling with Finite Elements",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "159--167",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Variational principles related to three areas of
                 semiconductor device modeling by the finite element
                 method are presented. Some subtle points which are
                 crucial to the successful application of the method are
                 explored. It is suggested that the validity of the
                 selected variational formulations must be carefully
                 ensured, and that the physics disciplines provide the
                 best guidance for the right selections.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits)",
  classification = "714; 921",
  corpsource =   "IBM General Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "device modelling; finite element analysis; finite
                 element method; finite elements modeling; mathematical
                 techniques --- Variational Techniques; semiconductor;
                 semiconductor device models; semiconductor devices;
                 variational principles; variational techniques",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Variational principles for semiconductor device
                 modelling with finite elements",
}

@Article{Dimsdale:1978:CCS,
  author =       "B. Dimsdale",
  title =        "Convex cubic splines",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "168--178",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D05",
  MRnumber =     "58 \#13617",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "383.41007",
  acknowledgement = ack-nhfb,
  classcodes =   "C4130 (Interpolation and function approximation)",
  corpsource =   "IBM Data Processing Div., Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "convex cubic splines; first derivative continuity;
                 large finite; slope case; spline segments; splines
                 (mathematics)",
  reviewer =     "J. G. Herriot",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bogy:1978:SAS,
  author =       "D. B. Bogy and F. E. Talke",
  title =        "Steady Axisymmetric Solutions for Pressurized Rotating
                 Flexible Disk Packs",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "179--184",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Steady solutions are obtained for undisturbed
                 pressurized flexible disk packs of various
                 configurations. Simplified fluid equations of motion
                 are coupled with the equations governing the deflection
                 of flexible membranes in order to arrive at the
                 differential equations for the spacing between the
                 disks of the pack. A simple asymptotic-solution formula
                 is derived for computing the dependence of the spacing
                 between two neighboring disks on air density and
                 viscosity, the volume rate of flow of air between the
                 two disks, the angular speed of rotation, and the
                 radial position on the disks.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media)",
  classification = "408; 721; 722",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air density; asymptotic solution formula; axisymmetric
                 solutions; data storage, magnetic; differential
                 equations; disk packs; flexible disk rotating; flexible
                 membranes; flow; magnetic disc and drum storage;
                 membranes; pressurised flexible disc packs; rate;
                 steady; undisturbed; undisturbed pressurized flexible
                 disk packs; viscosity",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fernandez:1978:ERA,
  author =       "E. B. Fern{\'a}ndez and T. Lang and C. Wood",
  title =        "Effect of Replacement Algorithms on a Paged Buffer
                 Database System",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "185--196",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A50",
  MRnumber =     "57 \#8220",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a database system a buffer may be used to hold
                 recently referenced pages. If this buffer is in virtual
                 memory, the database paging system and the memory
                 paging system affect its performance. The study of the
                 effect of main memory replacement algorithms on the
                 number of main memory page faults is the basic
                 objective of this paper. It is assumed that the buffer
                 replacement algorithm is least recently used (LRU), and
                 page fault rates for LRU, random (R), and generalized
                 least recently used (GLRU) main memory replacement
                 algorithms are calculated and compared. A set of
                 experiments validates these fault rate expressions and
                 establishes some conditions for the practical
                 application of the results.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160 (Database management
                 systems (DBMS))",
  classification = "723",
  corpsource =   "IBM Sci. Center, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "buffer replacement algorithm; data base paging system;
                 data base systems; database management systems; fault
                 rate expressions; main; main memory page faults; memory
                 paging system; memory replacement algorithms; paged
                 buffer database system; referenced pages; replacement
                 algorithms; virtual memory; virtual storage",
  reviewer =     "Leon Levy",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Easton:1978:MDR,
  author =       "M. C. Easton",
  title =        "Model for Database Reference Strings Based on Behavior
                 of Reference Clusters",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "2",
  pages =        "197--202",
  month =        mar,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68H05 (68B15)",
  MRnumber =     "80b:68117",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The observation that references to a particular page
                 are clustered (in time) in typical database reference
                 strings is used as the intuitive motivation for a model
                 of page reference activity in an interactive database
                 system. The model leads to a two-parameter form for the
                 (Denning) working-set functions associated with a page.
                 Methods for estimating parameter values from
                 measurements or from logical descriptions of
                 applications are discussed. Results from the model are
                 shown to agree well with measurements from two database
                 systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160 (Database management
                 systems (DBMS))",
  classification = "723; 921; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data base systems; data storage; database management
                 systems; database reference strings; Denning;
                 interactive database system; interactive systems; page;
                 probability; reference activity; reference clusters;
                 storage; virtual; working set functions two parameter
                 form",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Model for database reference strings based on
                 behaviour of reference clusters",
}

@Article{Bauschlicher:1978:MSC,
  author =       "Charles W. {Bauschlicher, Jr.} and Paul S. Bagus and
                 Henry F. {Schaefer III}",
  title =        "Model Study in Chemisorption: Molecular Orbital
                 Cluster Theory for Atomic Hydrogen on {Be(0001)}",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "213--234 (or 470--484??)",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The interaction between atomic hydrogen and the (0001)
                 surface of Be has been studied by using clusters of Be
                 atoms to simulate the substrate. The largest cluster
                 used contains 22 Be atoms, 14 in the first layer and 8
                 in a second layer. An H atom is added to the Be
                 clusters at four high symmetry adsorption sites. Ab
                 initio molecular orbital Hartree--Fock wave functions
                 have been obtained and the interaction energy of H with
                 the Be cluster is studied as a function of vertical
                 distance from the surface. Thorough studies of various
                 aspects of the computations and of the appropriate
                 interpretation of the cluster results are reported. The
                 authors' results show that three of the sites
                 considered have similar binding energies, D$_e$
                 approximately equals 50 kcal\slash mol (approximately
                 equals 2.1 multiplied by 10**5J\slash mol), and
                 (vertical) equilibrium distances from the surface,
                 r$_e$ approximately equals 0.1 nm. For the fourth site,
                 H directly over a Be atom, D$_e$ is approximately
                 equals 30 kcal\slash mol (1.3 multiplied by
                 10**5J\slash mol), and r$_e$ is approximately equals
                 0.14 nm.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3120E (Ab initio LCAO and GO SCF calculations (atoms
                 and molecules)); A3640 (Atomic and molecular clusters);
                 A6845 (Solid-fluid interface processes); A7320H
                 (Surface impurity and defect levels; energy levels of
                 adsorbed species); A8265M (Sorption and accommodation
                 coefficients (surface chemistry))",
  classification = "542; 549; 722; 723; 802; 921",
  corpsource =   "NASA, Hampton, VA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "ab initio calculations; ab initio SCF calculations;
                 Applications; Be cluster; beryllium; beryllium and
                 alloys --- Surfaces; binding energies; calculations;
                 chemisorption; Codes, Symbolic; Coding Architecture;
                 Data Storage, Magnetic--Disk; energies; energy; Error
                 Control Coding; Error Rate Performance; H; hydrogen;
                 interaction; Magnetic Disk Storage Products; molecular
                 clusters; molecular orbital Hartree Fock wave
                 functions; molecular orbitals; Multiple Burst Errors;
                 neutral atoms; SCF calculations; Two-Level Coding;
                 vibrational",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Brundle:1978:CPL,
  author =       "Christopher R. Brundle",
  title =        "Core-Level Photoemission and {LEED} Studies of
                 Adsorption at {Fe} Surfaces: Comparison between {CO}
                 and {O}$_2$",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "235--249",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Carbon monoxide and oxygen interactions with alpha
                 Fe(100) and polycrystalline surfaces have been studied
                 by x-ray photoemission (XPS or ESCA) and low energy
                 electron diffraction (LEED) at temperatures between 123
                 K and 473 K. For CO, the XPS results demonstrate the
                 existence of four electronically distinct CO adsorption
                 states; one is dissociative and three are molecular.
                 The binding energy analyses are consistent with one of
                 the latter molecular adsorption states, formed on the
                 polycrystalline surface, having a stretched CO bond
                 compared with the equivalent state on the Fe(100)
                 surface. For oxygen, only dissociative chemisorption is
                 observed, even at 123 K. Assuming monolayer coverage at
                 saturation allows calibration of the coverage for all
                 other situations of CO and O$_2$ adsorption. It is
                 demonstrated that at coverages of just greater than a
                 monolayer (293 K adsorption), Fe oxide species are
                 already present and that Fe**I**I**I dominates.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3365F (X-ray photoelectron spectra of molecules);
                 A6845 (Solid-fluid interface processes); A7960G
                 (Photoelectron spectra of composite surfaces); A8265M
                 (Sorption and accommodation coefficients (surface
                 chemistry))",
  classification = "545; 701; 802; 804; 931; 932",
  corpsource =   "Res. Div. Lab., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "123K; 473K; adsorption; alpha Fe(100); carbon
                 compounds; carbon monoxide --- Adsorption;
                 chemisorption; CO; core level photoemission;
                 diffraction; dissociative chemisorption; electrons ---
                 Diffraction; ESCA; Fe surface; iron; iron and alloys;
                 LEED; low energy electron; low energy electron
                 diffraction; molecular adsorption states; monolayer
                 coverage; O/sub 2/; oxygen; oxygen --- Adsorption;
                 photoemission; polycrystalline surfaces; X-ray
                 photoelectron spectra; XPS",
  treatment =    "X Experimental",
}

@Article{Pandey:1978:RAH,
  author =       "Kosal Chandra Pandey",
  title =        "Reaction of Atomic Hydrogen with {Si(111)} Surfaces:
                 Formation of Monohydride and Trihydride Phases",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "250--259",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "By using a realistic tight-binding or LCAO (linear
                 combination of atomic orbitals) model, detailed
                 calculations of surface states, local densities of
                 states, and theoretically simulated photoemission
                 spectra have been carried out for two qualitatively
                 distinct structural models for chemisorption of atomic
                 hydrogen on Si(111)1 multiplied by 1 surfaces. In the
                 low-coverage model, called the monohydride phase or
                 Si(111):H, it is assumed that a single hydrogen atom
                 sits on top of each surface Si atom, thus saturating
                 all dangling bonds. In the high-coverage model,
                 designated as the trihydride phase or Si(111):SiH$_3$,
                 SiH$_3$ radicals are bonded to the surface Si atoms.
                 Due to the radically different atomic structures, the
                 theoretical spectra of the two phases show striking
                 differences. A comparison of the theoretical spectra
                 with the ultraviolet photoemission spectra taken during
                 hydrogen chemisorption on the quenched Si(111)1
                 multiplied by 1 surface clearly shows that at low
                 coverages the monohydride is formed. while at high
                 coverages the trihydride phase is formed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6845 (Solid-fluid interface processes); A7320H
                 (Surface impurity and defect levels; energy levels of
                 adsorbed species); A7960G (Photoelectron spectra of
                 composite surfaces); A8265J (Heterogeneous catalysis at
                 surfaces and other surface reactions)",
  classification = "712; 804",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atomic hydrogen; calculations; chemisorption; electron
                 states; elemental; elemental semiconductors; high
                 coverage model; hydrogen; hydrogen --- Adsorption;
                 LCAO; local densities of states; low coverate; model;
                 monohydride phase; photoelectron spectra;
                 semiconducting silicon; semiconductors; Si(111)1 x 1;
                 Si(111):H; Si(111):SiH/sub 3/; silicon; spectra;
                 surface; surface electron states; surface states;
                 surface structure; surfaces; theoretical; tight-binding
                 calculations; trihydride phase; ultraviolet
                 photoemission spectra",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Winters:1978:CEW,
  author =       "Harold F. Winters",
  title =        "Chemisorption of Ethane on {W}(111)",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "260--264",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Ethane is chemisorbed on W(111) with a sticking
                 probability of approximately equals 0.003. The carbon
                 Auger spectrum at saturation coverage exhibits a
                 two-peak structure similar to that for graphite, while
                 the being approximately equals (low energy electron
                 diffraction) pattern is almost identical to that
                 obtained for an atomically clean surface. Heating
                 surface to approximately equals 773 K causes desorption
                 of hydrogen and changes the carbon Auger spectrum to a
                 three-peak structure similar to that for tungsten
                 carbide. After annealing, the LEED pattern is affected
                 in different ways depending on the precise conditions,
                 but it may in certain circumstances almost disappear.
                 Exposure to ethylene produces a similar sequence of
                 events. A large kinetic isotope effect is observed with
                 the ratio of the sticking probabilities left bracket
                 S(C$_2$H$_6$)/S(C$_2$D$_6$), W(111), T equals 300 K
                 right bracket being approximately equals 3. A similar
                 ratio is measured for tungsten at T equals 2500 K.
                 These data suggest that chemisorption is dissociative
                 in nature, probably involving the reaction C$_2$H$_6$
                 yields C$_2$H$_5$* plus H yields subsequent steps.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6845 (Solid-fluid interface processes); A7920F
                 (Electron-surface impact: Auger emission); A8265J
                 (Heterogeneous catalysis at surfaces and other surface
                 reactions)",
  classification = "543; 802; 804",
  corpsource =   "Res. Div. Lab., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealing; Auger effect; Auger spectrum;
                 chemisorption; diffraction; dissociative chemisorption;
                 ethane; hydrogen atom; kinetic isotope effect; LEED;
                 low energy electron; low energy electron diffraction;
                 organic compounds; tungsten; tungsten and alloys ---
                 Surfaces; tunnelling; W(111)",
  treatment =    "X Experimental",
}

@Article{Demuth:1978:MGA,
  author =       "Joseph E. Demuth",
  title =        "Molecular Geometries of Acetylene and Ethylene
                 Chemisorbed on {Cu}, {Ni}, {Pd}, and {Pt} Surfaces",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "265--276",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Ultraviolet photoemission measurements of the valence
                 orbital electronic structure of acetylene and ethylene
                 chemisorbed on Cu(100) or Cu(111), Ni(111), Pd(111),
                 and Pt(111) are presented. A comparison is made of the
                 measured energy levels of these chemisorbed species to
                 those of the free molecule and use a similar comparison
                 of the relative changes in ground state energy levels
                 of distorted free molecules calculated with a SCF-LCAO
                 (Self Consistent Field --- Linear Combination of Atomic
                 Orbitals) method to determine the molecular geometries
                 of these chemisorbed species. The limitations and
                 accuracies of such an approach are discussed. From the
                 determined geometries the authors identify two trends
                 in the structure of these chemisorbed molecules on
                 these surfaces: first, increasingly greater molecular
                 distortions occur with increasing atomic number of the
                 substrate atom, and secondly, greater molecular
                 disortions occur for ethylene than for acetylene on the
                 same metal.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3120E (Ab initio LCAO and GO SCF calculations (atoms
                 and molecules)); A3365C (UV and VUV photoelectron
                 spectra of molecules); A3520B (General molecular
                 conformation and symmetry; stereochemistry); A6845
                 (Solid-fluid interface processes); A7320H (Surface
                 impurity and defect levels; energy levels of adsorbed
                 species); A7960G (Photoelectron spectra of composite
                 surfaces)",
  classification = "544; 547; 548; 802; 804",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acetylene; atomic number; chemisorption;
                 configurations; copper and alloys --- Surfaces;
                 Cu(100); Cu(111); distortions; energy levels; ethylene;
                 ethylene --- Adsorption; ground state energy levels;
                 LCAO; molecular; molecular geometry; Ni(111); nickel
                 and alloys --- Surfaces; organic compounds; organic
                 molecule; organic molecule configurations; palladium
                 and alloys --- Surfaces; Pd(111); photoelectron
                 spectra; pi-d bonding interaction; platinum and alloys
                 --- Surfaces; Pt(111); SCF; transition metals;
                 ultraviolet photoemission measurement; valence orbital
                 electronic structure",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Chuang:1978:SPT,
  author =       "Tung J. Chuang and Klaus R. Wandelt",
  title =        "Sputter Profiling through {Ni\slash Fe} Interfaces by
                 {Auger} Electron Spectroscopy",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "277--284",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Sputter characteristics of nickel-iron systems in the
                 form of layer interfaces and bulk alloy films have been
                 studied by Auger electron spectroscopy. The sputter
                 rates for pure nickel and iron and their alloys have
                 been determined and are independent (within 10\%) of
                 the grain size and film composition. The various
                 factors that contribute to the broadening of depth
                 profiles have been examined. The initial broadening of
                 4.5 nm at zero overlayer thickness is mainly attributed
                 to the effects of electron escape depth and
                 compositional mixing due to ion bombardment. For thin
                 films, the depth-dependent broadening induced by
                 sputter damage has an approximately exponential
                 dependence on the overlayer thickness. For thick films,
                 this broadening induced by sputter damage has an
                 approximately exponential dependence on the overlayer
                 thickness. For thick films, this broadening is
                 estimated to be about 10\% of the sputter distance. The
                 effect of ion-induced surface compositional mixing as a
                 function of incident Ar** plus ion energy has been
                 studied by taking advantage of the different sampling
                 depths of low and high energy Auger electrons.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180J (Ion beam effects); A6848 (Solid-solid
                 interfaces); A7920F (Electron-surface impact: Auger
                 emission); A7920N (Atom-, molecule-, and ion-surface
                 impact)",
  classification = "539; 545; 548; 801",
  corpsource =   "Res. Div. Lab., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Ar/sup +/ ion energy; Auger effect; Auger electron;
                 bulk alloy films; depth profiles; interface; interface
                 structure; ion bombardment; ion-surface impact; iron;
                 iron and alloys; layer interfaces; Ni-Fe; nickel;
                 nickel and alloys; nickel iron alloys --- Thin Films;
                 reactive sputtering; spectroscopy; spectroscopy, Auger
                 electron; sputter damage; sputter profiling;
                 sputtering; thick films; thin films",
  treatment =    "X Experimental",
}

@Article{Young:1978:CET,
  author =       "Donald R. Young and Donelli J. DiMaria and William R.
                 Hunter and Carlos M. Serrano",
  title =        "Characterization of Electron Traps in
                 Aluminum-Implanted {SiO}$_2$",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "285--288",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "N. M. Johnson, W. C. Johnson, and M. A. Lampert have
                 studied the effect of Al implantation on the trapping
                 behavior of SiO$_2$. The large fluence that they used
                 (1 multiplied by 10**1**4Al\slash cm**2) and the low
                 annealing temperatures (up to 600 degree C) resulted in
                 a trapping efficiency of 1 and made it impossible to
                 characterize the traps. In the present study a lower
                 fluence and higher annealing temperatures to reduce the
                 trapping efficiency are used to permit characterization
                 of the traps. The predominant trap cross sections are
                 1.26 multiplied by 10** minus **1**6 and 1.40
                 multiplied by 10** minus **1**7 cm**2.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170T (Doping and implantation of impurities); A7340Q
                 (Metal-insulator-semiconductor structures); B2530F
                 (Metal-insulator-semiconductor structures)",
  classification = "482; 708",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al implantation; aluminium; annealing; dielectric
                 materials; electron; electron traps; insulating thin
                 films; ion implantation; metal insulator semiconductor;
                 metal-insulator-semiconductor structures; silica;
                 silicon compounds; SiO/sub 2/ film; structure; trap
                 cross sections; traps",
  treatment =    "X Experimental",
}

@Article{DiMaria:1978:LTC,
  author =       "Donelli J. DiMaria and Donald R. Young and William R.
                 Hunter and Carlos M. Serrano",
  title =        "Location of Trapped Charge in Aluminum-Implanted
                 {SiO}$_2$",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "289--293",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The position of the centroid of electrons trapped on
                 sites resulting from aluminum implantation into SiO$_2$
                 is measured by using the photo I-V technique for
                 energies from 15-40 keV, oxide thicknesses from 49-140
                 nm, and post-implant annealing temperatures from
                 600-1050 degree C in N$_2$ for 30 min. The centroid of
                 the trapped electrons is found to be identical to that
                 of the implanted aluminum for SIMS measurements,
                 regardless of annealing temperature from 600 to 1050
                 degree C, and located closer (by less than 9 nm) to the
                 Al-SiO$_2$, interface than predicted from the
                 Lindhard-Scharff-Schott (LSS) calculations of J. F.
                 Gibbons, W. S. Johnson, and S. W. Mylroie. Comparison
                 of centroids determined from photo I-V and SIMS
                 measurements as a function of SiO$_2$ thickness also
                 implies that the distributions of the ions and negative
                 trapped charge are the same.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6170T (Doping and implantation of impurities); A7240
                 (Photoconduction and photovoltaic effects;
                 photodielectric effects); A7340Q
                 (Metal-insulator-semiconductor structures); B2530F
                 (Metal-insulator-semiconductor structures)",
  classification = "482; 708",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "600-1050 degrees C; Al implantation; aluminium;
                 annealing; centroid of trapped; compounds; dielectric
                 materials; electron traps; electrons; film; ion
                 implantation; metal-insulator-; MOS; photoconductivity;
                 photocurrent; secondary ion mass spectroscopy;
                 semiconductor structures; silica; silicon; SIMS;
                 SiO/sub 2/",
  treatment =    "X Experimental",
}

@Article{Raider:1978:XPS,
  author =       "Stanley I. Raider and Richard Flitsch",
  title =        "{X}-ray Photoelectron Spectroscopy of {SiO$_2$-Si}
                 Interfacial Regions: Ultrathin Oxide Films",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "294--303",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The composition and width of the interfacial region
                 formed between this thermally-grown oxide films and
                 single-crystal Si substrates were nondestructively
                 characterized by means of x-ray photoelectron
                 spectroscopy. Data obtained from variations in
                 core-level binding energies, from variation in
                 photoelectron line intensities, and from variations in
                 photoelectron linewidths indicate the presence of a
                 nonstoichiometric oxide-Si transition region. The
                 composition and width of this region are dependent upon
                 substrate orientation, but are invariant with change in
                 other oxidation processing parameters. Transition
                 regions formed on 100 direction oriented substrates are
                 narrower and more completely oxidized than those formed
                 on 111 direction oriented substrates. Although both
                 Si-Si bonds and SiO-Si groups are present in this
                 nonstoichiometric region, they do not appear to be a
                 mixture of Si and SiO$_2$. Instead, a continuous
                 distribution of Si tetrahedra, Si-(O)$_x$(Si)$_{4-x}$,
                 are formed, in which $x$ changes from $0$ to $4$ as one
                 proceeds from the substrate to the stoichiometric
                 SiO$_2$ film.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6848 (Solid-solid interfaces); A6855 (Thin film
                 growth, structure, and epitaxy); A7340Q
                 (Metal-insulator-semiconductor structures); A7960E
                 (Photoelectron spectra of semiconductors and
                 insulators); B2530F (Metal-insulator-semiconductor
                 structures)",
  classification = "482; 708; 712; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "composition; compounds; core level binding energies;
                 dielectric materials --- Thin Films; elemental
                 semiconductors; films --- Dielectric; interface
                 structure; interfacial region; linewidths; oxidation;
                 photoelectron; photoelectron line intensities;
                 semiconducting silicon; semiconductor devices;
                 semiconductor insulator boundaries;
                 semiconductor-insulator boundaries; silica --- Thin
                 Films; silicon; SiO/sub 2/-Si interface; spectroscopy;
                 transition region; ultrathin oxide regions; width;
                 X-ray photoelectron; X-ray photoelectron spectra",
  treatment =    "X Experimental",
}

@Article{Ludeke:1978:EPS,
  author =       "Rudolf Ludeke",
  title =        "Electronic Properties of (100) Surfaces of {GaSb} and
                 {InAs} and their Alloys with {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "304--314",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Smooth, monocrystalline (100) surfaces of the alloys
                 In$_{1-x}$Ga$_x$As and GaSb$_{1-y}$As$_y$ were prepared
                 by molecular beam epitaxy. Both As-stabilized c(2
                 multiplied by 8) and metal-stabilized c(8 multiplied by
                 2) surface reconstructions were observed for
                 In$_{1-x}$Ga$_x$As over the entire alloy range.
                 GaSb$_{1-y}$As$_y$ exhibited a c(2 multiplied by 6) or
                 (2 multiplied by 3) structure for y approximately less
                 than 0.2, and, after a transition region, the
                 anion-stabilized c(2 multiplied by 8) or the
                 Ga-stabilized c(8 multiplied by 2) structures for y
                 approximately greater than 0.5. Electron energy loss
                 spectroscopy revealed the simultaneous presence of two
                 empty, dangling-bond-derived surface states in both
                 alloy systems. For In$_{1-x}$Ga$_x$As the In-derived
                 empty surface state lies approximately equals 0.4-0.5
                 eV below that of Ga and moves from above the conduction
                 band edge into the band gap for approximately greater
                 than 0.6. The overlap between the Ga-and In-derived
                 empty surface states causes the quenching of the Ga(3d)
                 surface exciton. For GaSb$_{1-y}$As$_y$ the Sb dangling
                 bonds generate an empty, localized surface state which
                 lies 0.2-0.3 eV above the empty, Ga-derived surface
                 state. Both levels lie above the conduction band edge
                 throughout the alloy range.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7320 (Electronic surface states); A7920K (Other
                 electron-surface impact phenomena); B2520D (II-VI and
                 III-V semiconductors)",
  classification = "712",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "anion stabilisation; As; compounds; electron energy
                 loss; electron energy loss spectra; electron states;
                 electron surface states; Ga stabilisation; gallium;
                 gallium antimonide; gallium arsenide; GaSb/sub
                 1-y/As/sub y/; III-V semiconductors; In/sub 1-x/Ga/sub
                 x/As; indium arsenide; indium compounds; metal
                 stabilisation; molecular beam epitaxy; monocrystalline
                 (100) surfaces; semiconducting gallium compounds;
                 semiconducting indium compounds; semiconductor alloys;
                 spectra; stabilisation; surface",
  treatment =    "X Experimental",
}

@Article{Simonyi:1978:OEF,
  author =       "Eva E. Simonyi and Josef F. Graczyk and Jerry B.
                 Torrance",
  title =        "Oriented epitaxial films of ({NMP}) ({TCNQ})",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "3",
  pages =        "315--320",
  month =        may,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An important step in the characterization or organic
                 conductors is the ability to correlate the solid state
                 electrical properties of these materials with their
                 composition and crystal structure. In many cases it has
                 not been possible to grow single crystals of suitable
                 size or purity for such investigations. The use of
                 epitaxial films represents an alternative approach. In
                 addition, such films may be potentially useful as
                 larger area conductive surfaces. This paper describes
                 the preparation of relatively large-area, oriented
                 epitaxial films of the organic conductor
                 N-methylphenazinium-7,7,8,8-tetracyanoquinodimethanide
                 (NMP) (TCNQ) by means of vacuum evaporation. Factors
                 that appear to affect the degree of orientation, the
                 film areas, and the chemical composition include the
                 source temperature, the kind of evaporation (rapid or
                 slow), the degree of lattice matching between the
                 substrate and the organic material, and the substrate
                 surface charge potential.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A8110B (Crystal growth from vapour); A8115G (Vacuum
                 deposition); B0510D (Epitaxial growth)",
  classification = "712",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chemical composition; compounds; epitaxial layers;
                 evaporation; lattice matching;
                 methylphenazinium-7,7,8,8-tetracyanoquinodimethanide;
                 N-; NMP-TCNQ; one-dimensional conductivity; organic;
                 organic compounds; organic conductor; orientation;
                 oriented epitaxial films; potential; semiconducting
                 films; semiconducting organic compounds; source;
                 substrate surface charge; temperature; vacuum; vapour
                 phase epitaxial growth",
  treatment =    "P Practical; X Experimental",
}

@Article{Schwuttke:1978:LCS,
  author =       "Guenter H. Schwuttke and Ted F. Ciszek and Kuei H.
                 Yang and Alexander Kran",
  title =        "Low Cost Silicon for Solar Energy Conversion
                 Applications",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "335--345",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Economically viable means of producing silicon solar
                 cells for the conversion of solar energy into electric
                 power are discussed. Emphasis is given to the
                 discussion of crystal growth techniques capable of
                 growing single-crystal silicon ribbons directly and
                 inexpensively from molten silicon. The capillary action
                 shaping technique (CAST) recently developed by IBM has
                 a good potential for producing low cost silicon sheets
                 suitable for solar cells. This technique has produced
                 ribbon 100 mm wide and 0.3 mm thick. Problems that CAST
                 must overcome in order to supply material for low cost
                 solar cells are discussed. Economic and technological
                 computer-modeled comparisons indicate that continuously
                 grown CAST ribbons of these dimensions can meet a cost
                 objective below 50/m**2 of sheet material. The results
                 require that it be possible to fabricate a
                 twelve-percent-efficient solar cell from CAST ribbon
                 100 mm wide and 0.3 mm thick at a polycrystalline
                 silicon cost of 10\slash kg.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8110F (Crystal growth from melt); A8630J
                 (Photoelectric conversion; solar cells and arrays);
                 B0510 (Crystal growth); B8420 (Solar cells and
                 arrays)",
  classification = "702; 712",
  corpsource =   "IBM, System Products Div., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "action shaping technique; capillary; cost; crystal
                 growth from melt; elemental semiconductors; molten Si;
                 ribbons; semiconducting silicon; semiconductor growth;
                 Si solar cell production; silicon; solar cells; solar
                 energy conversion",
  treatment =    "A Application; E Economic",
}

@Article{Blakeslee:1978:GPG,
  author =       "A. Eugene Blakeslee and Stanley M. Vernon",
  title =        "Growth of Polycrystalline {GaAs} for Solar Cell
                 Applications",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "346--352",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Films of polycrystalline GaAs have been grown on
                 foreign substrates by the metal-organic process. The
                 main objective was to produce films with as large a
                 grain size as possible, so that high-efficiency
                 photovoltaic devices may eventually be fabricated from
                 such thin film\slash substrate structures. At 973 K the
                 average grain size was less than 1 $\mu$ m, and was
                 unaffected by the choice of substrate. Increasing the
                 deposition temperature to 1123 K, while maintaining all
                 other conditions the same, resulted in grains as large
                 as 10 to 20 $\mu$ m in diameter. Grain sizes as large
                 as 10 $\mu$ m could be obtained by precoating the
                 substrates with thin films of evaporated gold or tin.
                 However, both of t methods gave films that were
                 discontinuous. A two-step procedure in which the films
                 were nucleated at 873 K prior to growth at 1123 K
                 yielded continuous films with an average grain size of
                 5 $\mu$ m. Schottky barrier solar cells fabricated from
                 these films exhibited short-circuit current densities
                 as high as 15.7 mA\slash cm**2, even though the highest
                 conversion efficiency (AM0, uncoated) was only 1.3
                 percent because of the low fill factor (0.28).",
  acknowledgement = ack-nhfb,
  classcodes =   "A7240 (Photoconduction and photovoltaic effects;
                 photodielectric effects); A8115H (Chemical vapour
                 deposition)A8630J (Photoelectric conversion; solar
                 cells and arrays); B0520F (Vapour deposition); B4250
                 (Photoelectric devices); B8420 (Solar cells and
                 arrays)",
  classification = "702; 712; 714; 741; 941",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chemical vapour deposition; circuit current density;
                 continuous films; conversion; efficiency; fill factor;
                 gallium arsenide; grain size; III-V semiconductors;
                 metal/organic process; photovoltaic cells; photovoltaic
                 devices; polycrystalline GaAs; Schottky barrier;
                 semiconducting gallium compounds; semiconductor;
                 semiconductor growth; short; short-circuit currents;
                 solar cell; solar cells; thin films",
  treatment =    "A Application",
}

@Article{Merritt:1978:OPM,
  author =       "Vingie Y. Merritt",
  title =        "Organic Photovoltaic Materials: Squarylium and
                 Cyanine-{TCNQ} Dyes",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "353--371",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The photovoltaic properties of Schottky barrier
                 sandwich cells consisting of sublimed and solution-cast
                 thin films of selected squarylium (bis-anilino
                 derivatives of cyclobuta-1,3-diene-2,4-dione) and
                 cyanine-tetracyanoquinodimethanide (TCNQ) dyes have
                 been measured. Amorphous solid solutions of 1.1 prime
                 -diethyl-2,2 prime -dicarbocyanine-and oxa-2,2 prime
                 -dicarbocyanine-TCNQ salts were also tested. The
                 effects of various material and device properties on
                 the performance of organic photovoltaic cells are
                 discussed, and it is proposed that organic solar cells
                 having efficiencies of one percent or more can be made
                 by using existing technologies.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7240 (Photoconduction and photovoltaic effects;
                 photodielectric effects); A7330 (Surface double layers,
                 Schottky barriers, and work functions); A8630J
                 (Photoelectric conversion; solar cells and arrays);
                 B4210 (Photoconducting materials and properties); B4250
                 (Photoelectric devices); B8420 (Solar cells and
                 arrays)",
  classification = "708; 712; 714; 741; 804; 941",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cells; cyanine/TCNQ dye; efficiencies; organic
                 compounds; organic photovoltaic cells; organic solar;
                 performance; photoconducting materials; photovoltaic;
                 photovoltaic cells; Schottky barrier sandwich cells;
                 Schottky effect; solar cells; squarylium; thin films",
  treatment =    "A Application; X Experimental",
}

@Article{Pettit:1978:SAS,
  author =       "G. David Pettit and Jerome J. Cuomo and Thomas H.
                 DiStefano and Jerry M. Woodall",
  title =        "Solar Absorbing Surfaces of Anodized Dendritic
                 Tungsten",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "372--377",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Anodization of textured tungsten is shown to have
                 merit either in creating a solar absorber of extremely
                 high absorptance when applied to a large dendritic
                 surface, or in enhancing the solar
                 absorptance-to-emittance ratio when applied to smaller
                 hillock topographies. The angular dependence of the
                 absorption is reduced by the anodization coating, which
                 consists of a thin conformal coating of WO$_3$. The
                 surface is stable up to temperatures of 520 K in air.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8630S (Photothermal conversion)",
  classification = "539; 543; 657",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "angular dependence; anodisation; anodized dendritic
                 tungsten; conformal coating; dendritic; dendritic
                 structure; hillock topographies; solar absorber; solar
                 absorber-convertors; solar radiation; surface; thin;
                 tungsten; tungsten and alloys --- Anodic Oxidation",
  treatment =    "A Application",
}

@Article{Jurovics:1978:OAD,
  author =       "Steve A. Jurovics",
  title =        "Optimization Applied to the Design of an
                 Energy-Efficient Building",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "378--385",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "There are several public domain, and numerous
                 proprietary, computer programs that provide detailed
                 simulations of the heating and cooling requirements for
                 a building. Such programs are often used to evaluate
                 changes in the design of a building that are made to
                 decrease its energy requirements. A user is considered
                 to be working in a trial-and-error mode if each
                 execution of the program provides no formal guidance
                 for the next change. This work reports on an
                 investigation of the imbedding of such an energy
                 analysis program into an optimization structure. Such
                 an arrangement would enable a user to specify a set of
                 architectural and construction parameters and the
                 limits within which they might vary, and from this to
                 determine the parameters that yield a local minimum in
                 thermal load and the sensitivity of this load to
                 changes in these parameters.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3330 (Control applications in building and civil
                 engineering); C7440 (Civil and mechanical engineering
                 computing)",
  classification = "402; 901",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architectural CAD; architectural parameters;
                 buildings; construction parameters; energy analysis
                 program; energy efficient building design; limits;
                 optimisation; optimization structure; sensitivity;
                 sensitivity analysis; thermal load",
  treatment =    "A Application",
}

@Article{Kaneko:1978:CCP,
  author =       "Toyohisa Kaneko",
  title =        "Color Composite Pictures from Principal Axis
                 Components of Multispectral Scanner Data",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "386--392",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When principal axis transformations are applied to
                 multispectral scanner (MSS) data, the majority of data
                 variability is shown to be contained in the first two
                 or three components. A method is described for
                 generating a color composite picture from these
                 components whereby most of the information collected by
                 an MSS can be conveyed in a single color picture. The
                 first component is found to be a weighted sum of image
                 data from all channels, and therefore it is natural to
                 associate the first component with brightness. To be
                 consistent with this interpretation, only the first
                 component of the transformed data is used to control
                 the brightness of the color composite picture.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0768 (Photography, photographic instruments and
                 techniques); A4230V (Image processing and restoration);
                 A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B6140C
                 (Optical information, image and video signal
                 processing); B7710 (Geophysical techniques and
                 equipment)",
  classification = "742",
  corpsource =   "IBM, Federal Systems Div., Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "brightness; colour composite; colour photography; data
                 conversion; data variability; multispectral scanner
                 data; picture; picture processing; principal axis
                 transformations; remote sensing; weighted sum",
  treatment =    "A Application",
}

@Article{West:1978:GTC,
  author =       "Colin H. West",
  title =        "General Technique for Communications Protocol
                 Validation",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "393--404",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A technique for the validation of protocols in
                 communications systems is described. It can be used for
                 systems composed of processes that can be modeled as
                 finite directed graphs. The validation exhaustively
                 exercises the interaction domain of a system and
                 identifies all occurrences of a number of well-defined
                 error conditions. The method can detect when individual
                 processes have no predefined response to incoming
                 messages, as well as system deadlocks and potential
                 loss of messages due to overflow conditions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210 (Telecommunication applications)",
  classification = "723",
  corpsource =   "IBM, Zurich Res. Div. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "communications protocol validation; computers;
                 directed graphs; error conditions; error detection;
                 finite directed graphs; overflow conditions; system
                 deadlocks; telecommunication",
  treatment =    "P Practical",
}

@Article{Franaszek:1978:AVT,
  author =       "Peter A. Franaszek and Brian T. Bennett",
  title =        "Adaptive Variation of the Transfer Unit in a Storage
                 Hierarchy",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "405--412",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Consider a paged storage hierarchy with at least two
                 levels L$_1$ and L$_2$, where L$_1$ denotes main
                 storage and L$_2$ secondary storage. Suppose that the
                 unit of replacement for L$_1$ is a single page, and
                 that the L$_2$-to-L$_1$ transfer unit, given a page
                 fault, is an integer number of pages. Then, given a
                 suitable replacement policy for L$_1$, increasing the
                 unit of transfer often results in a lower miss ratio at
                 the expense of increased paging traffic. The
                 possibility is explored of adaptively varying the
                 L$_2$-to-L$_1$ transfer unit as a function of the
                 reference history of the data to be fetched.
                 Experiments on traces drawn from two large data base
                 systems suggested that such adaptation can result in
                 improved tradeoffs between miss ratios and paging
                 traffic.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adaptive variation; computer operating systems; main
                 storage; miss ratios; paged storage hierarchy; paging
                 traffic; reference history; secondary storage; storage
                 management; tradeoffs; transfer unit",
  treatment =    "P Practical",
}

@Article{Alfonseca:1978:MAI,
  author =       "Manuel Alfonseca and Maria L. Tavera",
  title =        "A machine-independent {APL} interpreter",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "413--421",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of writing machine-independent APL
                 interpreters is solved by means of a systems
                 programming approach making use of an intermediate
                 level language specially designed for that purpose. The
                 language, as well as the procedure used to build
                 universal interpreters, are described. Three compilers
                 that translate this language for three different
                 machines have been written so far, and an APL
                 interpreter has been finished.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "723",
  corpsource =   "IBM, Sci. Centre, Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL interpreter; compilers; computer operating
                 systems; intermediate level; language; procedure
                 oriented languages; program interpreters; systems
                 programming; universal interpreters",
  treatment =    "P Practical",
}

@Article{Lewis:1978:OPM,
  author =       "Sanford J. Lewis",
  title =        "Organic Photovoltaic Materials: Squarylium and
                 Cyanine-{TCNQ} Dyes",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "422--428",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The photovoltaic properties of Schottky barrier
                 sandwich cells consisting of sublimed and solution-cast
                 thin films of selected squarylium (bis-anilino
                 derivatives of cyclobuta-1,3-diene-2,4-dione) and
                 cyanine-tetracyanoquinodimethanide (TCNQ) dyes have
                 been measured. Amorphous solid solutions of 1,1 prime
                 -diethyl-2,2 prime -dicarbocyanine-and oxa,2,2 prime
                 -dicarbocyanine-TCNQ salts were also tested. The
                 effects of various material and device properties on
                 the performance of organic photovoltaic cells are
                 discussed, and it is proposed that organic solar cells
                 having efficiencies of one percent or more can be made
                 by using existing technologies.",
  acknowledgement = ack-nhfb,
  classification = "531; 539; 712; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "films",
  xxnote =       "Check: page number overlap with
                 \cite{Lewis:1978:RML}.",
}

@Article{Lewis:1978:RML,
  author =       "S. J. Lewis",
  title =        "Regression model for {LPE} film property control",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "422--428",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A8110D (Crystal growth from solution); A8115L
                 (Deposition from liquid phases (melts and solutions));
                 B0510D (Epitaxial growth); C3120N (Thermal variables
                 control); C3355Z (Control applications in other
                 manufacturing processes)",
  corpsource =   "IBM, General Products Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "CaGe films; collapse field; compensating growth
                 strategies; depletion; epitaxial layers; feedback;
                 fluctuations in growth conditions; Ga films; liquid
                 phase epitaxial film; liquid phase epitaxial growth;
                 modelling; properties; real time feedback control
                 scheme; regression equations; temperature control",
  treatment =    "A Application; T Theoretical or Mathematical",
  xxnote =       "Check: page number overlap with
                 \cite{Lewis:1978:OPM}.",
}

@Article{Holmes:1978:RCN,
  author =       "W. N. Holmes",
  title =        "Representation for complex numbers",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "4",
  pages =        "429--430",
  month =        jul,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Australia Ltd., Canberra, ACT, Australia",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complex number representation; feasibility; number
                 theory; real bases; single component scheme",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Santisteban:1978:PCM,
  author =       "A. Santisteban and L. Munoz",
  title =        "Principal Components of a Multispectral Image:
                 Application to a Geological Problem",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "444--454",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The principal components of a multispectral image are
                 studied with special emphasis placed on
                 photointerpretation applications. The method used to
                 obtain these components involves a linear radiometric
                 enhancement which avoids artifact creation and does not
                 require extra computational work. The results have been
                 particularized to Landsat multispectral scanner images
                 and applied to the geological study of a sedimentary
                 basin in central Spain.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9165 (Geophysical aspects of geology and mineralogy);
                 A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B7710
                 (Geophysical techniques and equipment)",
  classification = "405; 481; 742",
  corpsource =   "Madrid Sci. Center, IBM, Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "geology; geophysical techniques; Landsat; linear
                 radiometric enhancement; multispectral remote;
                 multispectral scanner images; photointerpretation;
                 remote sensing; sedimentary basin; sensor; Spain",
  treatment =    "A Application; P Practical",
}

@Article{Hernandez:1978:MPR,
  author =       "V. M. Hernandez and M. A. Flores",
  title =        "Machine Processing of Remotely Sensed Data: Three
                 Applications in {Mexico}",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "455--463",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In general, ground-data acquisition procedures in
                 developing countries are not very efficient, and the
                 resulting lack of reliable data produces significant
                 delays in important management-planning decision. A
                 description is given of three studies involving
                 different applications of machine processing of
                 remotely sensed data, a recent technology that appears
                 to have potential use for timely ground-information
                 acquisition. The general methodology describes the use
                 of a special software processing system. Finally, some
                 conclusions are presented relating to the specific
                 problems discussed and to the advantages of remote
                 sensing in general.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8670L (Measurement techniques and instrumentation in
                 environmental science); A9365 (Data and information;
                 acquisition, processing, storage and dissemination in
                 geophysics); C7340 (Geophysics computing); C7890 (Other
                 special applications of computing)",
  classification = "405; 723; 742",
  corpsource =   "Mexico Sci. Center, IBM, Mexico City, Mexico",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computing; crop area evaluation; data acquisition;
                 data processing; data reduction and analysis;
                 developing countries; erosion; erosion zones;
                 geography; geophysics; geophysics computing; land use
                 mapping; Mexico; natural resources; remote; remote
                 sensing; sensing; water resources monitoring",
  treatment =    "A Application; P Practical",
  xxauthor =     "M. {Hernandez V.} and A. {Flores M.}",
}

@Article{Todini:1978:UDC,
  author =       "E. Todini",
  title =        "Using a Desk-Top Computer for an On-Line Flood Warning
                 System",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "464--471",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Consideration of the development of an adaptive model
                 that is applicable to real-time forecasting of
                 hydrologic processes. The rainfall-runoff process is
                 considered here. In this model the discharge was
                 modeled as autoregressive with past discharges and a
                 moving average representation on the precipitation. The
                 model makes use of the Constrained Linear Systems (CLS)
                 technique to split the precipitation into two rainfall
                 inputs by using a threshold based on an antecedent
                 precipitation index. This technique can be thought of
                 as a piecewise linearization of a nonlinear process.
                 The real-time forecasting model is a time invariant
                 linear state model where the state variables, discharge
                 and rainfall, are estimated by the Kalman filtering
                 algorithm and the unknown model parameters by using the
                 instrumental variables approach. This technique is
                 applied in a case study using data from the Ombrone
                 River Basin, Italy, and was implemented on a small
                 desk-top computer.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9240F (Rivers, runoff, and streamflow); A9385
                 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); C1290B
                 (Systems theory applications in natural resources and
                 ecology); C7340 (Geophysics computing); C7890 (Other
                 special applications of computing)",
  classification = "442; 723",
  corpsource =   "Italy Sci. Center, IBM, Pisa, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adaptive model; computers, miniature --- Applications;
                 computing; constrained linear; filtering and prediction
                 theory; flood warning system; floods; hydrologic
                 processes; hydrological techniques; hydrology; Italy;
                 Kalman filtering algorithm; Kalman filters;
                 meteorology; Ombrone River Basin; piecewise linear
                 system; piecewise-linear techniques; precipitation
                 index; rainfall; rainfall runoff process; real; rivers;
                 safety systems; system; time forecasting; time
                 invariant linear state model",
  treatment =    "A Application; P Practical",
}

@Article{Sguazzero:1978:HNM,
  author =       "P. Sguazzero and C. Chignoli and R. Rabagliati and G.
                 Volpi",
  title =        "Hydrodynamic Numeric Modeling of the {Lagoon of
                 Venice}",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "472--480",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Description of two hydrodynamic numeric models and
                 their application to the Lagoon of Venice, Italy. The
                 models are based on the same mesh, bottom topography,
                 boundary conditions, and spatial distribution of the
                 bottom friction coefficient (Chezy coefficient).
                 Although quite different in structure, both models
                 ultimately provide sea level fluctuation and current
                 speed at each mesh-point as functions of time. The
                 first model numerically integrates the time-dependent,
                 nonlinear, hyperbolic shallow water equations, written
                 in conservation form, with a space-staggered
                 leapfrog-type (time dense) scheme. The model is suited
                 to episode simulation and is a particularly useful tool
                 for system management and control. The second model is
                 suited to long-term simulations and models only the
                 astronomic tide; it solves a hybrid
                 (differential-algebraic) system resulting from
                 semilinearization of the shallow water equations under
                 harmonic assumptions for the tide.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9210H (Surface waves, tides, and sea level); A9210S
                 (Coastal and estuarine oceanography); A9330G (Europe);
                 A9330R (Regional seas); C4170 (Differential equations);
                 C7340 (Geophysics computing)",
  classification = "471; 631",
  corpsource =   "Italy Sci. Center, IBM, Venice, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "astronomic; Chezy; computing; differential equations;
                 digital simulation; equations; geophysics computing;
                 hydrodynamic numerical models; hydrodynamics;
                 nonlinear; nonlinear hyperbolic equations;
                 oceanography; parameter; partial differential; sea
                 level fluctuation; semilinearization; shallow water
                 equations; spatial distribution; tidal basins; tidal
                 dynamics; tide; tides",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Gazdag:1978:ESW,
  author =       "J. Gazdag",
  title =        "Extrapolation of Seismic Waveforms by {Fourier}
                 Methods",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "481--486",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of constructing a cross section of
                 reflectivity from the wave field recorded at the
                 surface of the medium is discussed with particular
                 reference to migration of seismic records. The
                 numerical procedures are formulated in the frequency
                 and wavenumber domain. The operations are defined in a
                 fixed coordinate system, whereas finite difference
                 methods require a downward-moving reference frame. The
                 numerical algorithms in the frequency wavenumber domain
                 are simpler and give more accurate results than finite
                 difference methods. This is particularly true when the
                 lateral velocity variation in the medium can be
                 neglected. In this case the downward wave extrapolation
                 is accomplished by implementing a phase change in the
                 Fourier coefficients. Numerically, this is equivalent
                 to a multiplication by a complex number of unit
                 modulus. There is no stability condition associated
                 with this operation. This means that the source and
                 recorder positions can be lowered by any amount within
                 one computational step.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9130F (Seismic waves); A9385 (Instrumentation and
                 techniques for geophysical, hydrospheric and lower
                 atmosphere research); C4190 (Other numerical methods);
                 C7340 (Geophysics computing)",
  classification = "484",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computing; cross section of reflectivity; data
                 reduction and analysis; downward wave extrapolation;
                 fast Fourier transforms; finite difference methods;
                 fixed coordinate system; Fourier analysis; Fourier
                 transforms; frequency wavenumber domain; geophysical
                 techniques; geophysics; geophysics computing; migration
                 of seismic records; numerical methods; seismic
                 waveforms extrapolation; seismic waves",
  treatment =    "A Application",
}

@Article{Low:1978:DWD,
  author =       "D. W. Low",
  title =        "A Directed Weather Data Filter",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "487--497",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is important to reduce the computational burden of
                 energy-analysis computer programs (such as those that
                 compute expected heating and cooling loads and the
                 energy required to meet these loads) since the input
                 may include, for example, hourly measurements of
                 several weather variables over periods of time of up to
                 ten years. It is possible to generate a small set of
                 weather data to represent a larger, more comprehensive
                 set by using computer programs called weather data
                 filters. However, existing filters that are generally
                 able to preserve statistical properties of the original
                 data offer no a priori method for controlling or even
                 estimating the errors they introduce in the output of
                 the energy analysis programs. A description is given of
                 a weather filter that preserves the ``energy content''
                 of the data; i.e., given a particular building design
                 and usage schedule, this filter generates a small set
                 of weather data which, when properly weighted, produces
                 the same total heating and cooling loads as the
                 original data. Because the error caused by using the
                 filtered weather data falls well within acceptable
                 bounds even when changes are made in the building
                 design, the filter described allows the designer to
                 test a large number of design or retrofit alternatives
                 for energy efficiency at very low computational cost.
                 5",
  acknowledgement = ack-nhfb,
  classcodes =   "C7440 (Civil and mechanical engineering computing)",
  classification = "402; 723; 901",
  corpsource =   "Los Angeles Sci. Center, IBM, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "building; buildings; CAD; computational cost; cooling;
                 directed weather data filter; energy efficiency; energy
                 utilization --- Computer Applications; engineering
                 computing; heating; space; system; total energy; total
                 energy systems",
  treatment =    "A Application",
}

@Article{Bard:1978:AMV,
  author =       "Y. Bard",
  title =        "An analytic model of the {VM\slash 370} system",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "498--508",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "382.68033",
  abstract =     "An Analytic model is described of an interactive
                 multiprogrammed computer system. The model accepts a
                 multiple-user-class, transaction-oriented workload
                 description and a system configuration description, and
                 it produces predictions of resource utilizations,
                 transaction rates, and average transaction response
                 times. The solution method involves nearly complete
                 decomposition, with a closed queuing network
                 representing the multiprogrammed set. Asymptotic
                 formulas are used to generate good initial guesses for
                 an overall iterative scheme. Extensive validation
                 results are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "722; 723",
  corpsource =   "Cambridge Sci. Center, IBM, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytic model; average; closed queuing network;
                 computer performance prediction; computer selection and
                 evaluation; computer systems programming ---
                 Multiprogramming; computer systems, digital;
                 interactive multiprogrammed computer; interactive
                 systems; iterative scheme; multiprogrammed set model;
                 multiprogramming; resource utilizations; system;
                 transaction rates; transaction response times;
                 validation; virtual machines; virtual storage; VM/370",
  treatment =    "A Application",
}

@Article{Todd:1978:AHM,
  author =       "S. Todd",
  title =        "Algorithm and Hardware for a Merge Sort Using Multiple
                 Processors",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "509--517",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An algorithm is described that allows log (n)
                 processors to sort n records in just over 2n write
                 cycles, together with suitable hardware to support the
                 algorithm. The algorithm is a parallel version of the
                 straight merge sort. The passes of the merge sort are
                 run overlapped, with each pass supported by a separate
                 processor. The intermediate files of a serial merge
                 sort are replaced by first-in first-out queues. The
                 processors and queues may be implemented in
                 conventional solid logic technology or in bubble
                 technology. A hybrid technology is also appropriate.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "United Kingdom Sci. Center, IBM, Durham, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems programming; logic circuits; magnetic
                 bubble devices; merging; multiple; processors; run
                 overlapped passes; sorting",
  treatment =    "P Practical",
}

@Article{Schild:1978:CDA,
  author =       "W. Schild and B. Lunenfeld and B. Gavish",
  title =        "Computer-Aided Diagnosis with an Application to
                 Endocrinology",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "518--532",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An interactive system for computer-assisted medical
                 diagnosis is described. Medical experts are provided
                 with a framework in which to translate the knowledge on
                 which their decisions are based. The technique is based
                 on simulating the physician's own diagnostic process.
                 The approach taken allows consistency and completeness
                 checks to be made, thereby achieving a high degree of
                 reliability. Information related to a given specialty
                 is described in terms of disorder patterns, clinical
                 facts, and logical relationships among the clinical
                 data. Laboratory results are processed by a subsystem
                 which uses physician-supplied rules to establish
                 validity and to interpret the test data with respect to
                 their diagnostic significance. The system incorporates
                 a dynamically generated questionnaire which provides
                 efficient gathering of anamnestic, observational, and
                 other clinical parameters. The physician is prompted
                 for relevant patient data by an algorithm which assures
                 that an almost minimal amount of information is
                 requested.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7330 (Biology and medical computing)",
  classification = "461",
  corpsource =   "Israel Sci. Center, IBM, Haifa, Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "biomedical engineering; endocrinology; interactive
                 system; interactive systems; medical diagnostic
                 computing",
  treatment =    "A Application",
}

@Article{Sibuya:1978:NMN,
  author =       "M. Sibuya and T. Fujisaki and Y. Takao",
  title =        "Noun-Phrase Model and Natural Query Language",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "533--540",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Basic considerations in designing a natural data base
                 query language system are discussed. The notion of the
                 noun-phrase data model is elaborated, and its role in
                 making a query system suitable for general use is
                 stressed. An experimental query system, Yachimata,
                 embodying the concept, is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160 (Database management
                 systems (DBMS))",
  classification = "723",
  corpsource =   "Tokyo Sci. Center, IBM, Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data base languages;
                 data base systems; data structures; database management
                 systems; interactive; interactive system; Japanese
                 language; language dialogue; model; natural; natural
                 query language; noun phrase; query system; systems;
                 Yachimata",
  treatment =    "A Application; G General Review",
}

@Article{Antonacci:1978:APQ,
  author =       "F. Antonacci and P. Dell'Orco and V. N. Spadavecchia
                 and A. Turtur",
  title =        "{AQL}: a Problem-Solving Query Language for Relational
                 Data Bases",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "541--559",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "AQL is a query language based on a data management
                 system which uses Codd's relational model of data. It
                 has been designed mainly to be used by the
                 nonspecialist in data processing for interactive
                 problem solving, application building, and simulation.
                 Ease of use is achieved by providing an interface which
                 allows the use of default options, synonyms, and
                 definitions of attributes, inference, and the
                 possibility of interactive completion of the query
                 (i.e., menu). AQL combines the capabilities of the
                 relational model of data with the powerful
                 computational facilities and control structure of the
                 host programming language (i.e., APL). A prototype
                 version of AQL, which has been implemented, is
                 reviewed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160D (Relational
                 databases)",
  classification = "723",
  corpsource =   "Centro di Ricerca, IBM, Bari, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Codd's relational model; computer programming
                 languages; data base languages; data base management
                 system; data base systems; database management systems;
                 interactive system; interactive systems; problem
                 solving query language; relational data base",
  treatment =    "G General Review",
}

@Article{Antonacci:1978:APS,
  author =       "F. Antonacci and P. Dell'Orco and V. N. Spadavecchia
                 and A. Turtur",
  title =        "{AQL}: a problem-solving query language for
                 relational data bases",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "??",
  pages =        "541--559",
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "382.68032",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lehmann:1978:INL,
  author =       "H. Lehmann",
  title =        "Interpretation of Natural Language in an Information
                 System",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "5",
  pages =        "560--572",
  month =        sep,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Discussion of some of the linguistic problems
                 encountered during the development of the User
                 Specialty Languages (USL) system, an information system
                 that accepts a subset of German or English as input for
                 query, analysis, and updating of data. The system is
                 regarded as a model for portions of natural language
                 that are relevant to interactions with a data base. The
                 model provides insight into the functioning of language
                 and the linguistic behavior of users who must
                 communicate with a machine in order to obtain
                 information. The aim of application independence made
                 it necessary to approach many problems from a different
                 angle than in most comparable systems. Rather than a
                 full treatment of the linguistic capacity of the
                 system, details of phenomena such as time handling,
                 coordination, quantification, and pronouns are
                 presented. The solutions that have been implemented are
                 described, and open questions are pointed out.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160 (Database management
                 systems (DBMS))",
  classification = "723",
  corpsource =   "Germany Sci. Center, IBM, Heidelberg, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data base languages;
                 data base systems; database management system; database
                 management systems; information system; interactive
                 system; interactive systems; language; natural; User
                 Specialty Languages",
  treatment =    "G General Review",
}

@Article{Reisman:1978:AGD,
  author =       "A. Reisman and K. C. Park",
  title =        "{AC} Gas Discharge Panels: Some General
                 Considerations",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "589--595",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An attempt is made to provide some perspective on the
                 key technology issues associated with AC gas panel
                 displays to set the stage for a series of nine
                 technology and physics-oriented papers that follow. It
                 uses the cathode ray tube as a reference for comparison
                 and defines some of the unique technological features
                 of matrix-addressed displays generally and AC gas
                 discharge panels specifically.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2380 (Gas discharge tubes and devices); B7260
                 (Display technology and systems)",
  classification = "723; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas discharge panels; AC gas panel displays;
                 cathode ray tube; display devices; gas panel displays;
                 gas-discharge tubes; matrix addressed displays;
                 technology",
  treatment =    "G General Review",
}

@Article{Reisman:1978:SGP,
  author =       "A. Reisman and M. Berkenblit and S. A. Chan",
  title =        "Single-Cycle Gas Panel Assembly",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "596--600",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A single-cycle process has been developed in which the
                 two halves of a gas panel are assembled, sealed, and
                 filled in a continuous, automatically sequenced,
                 controlled-ambient furnace. The entire fabrication
                 operation, including seal, degas, backfill, and
                 tip-off, may be accomplished in a single thermal cycle.
                 During heat-up, the panel parts and furnace chamber are
                 degassed in a programmed cyclic fill (to 20 mm of Hg)
                 and pump-down (to 100 $\mu$ m of Hg). The panels are
                 sealed in a clean-air ambient at a temperature of 495
                 plus or minus 5 degree C. Prior to backfilling with a
                 purified Penning gas mixture and tip-off of the panel,
                 the same gas is used in a cyclic fill and evacuate
                 process to remove air and other contaminants. The
                 entire panel fabrication program takes about 8 hours.
                 Details of equipment construction operation are
                 presented, as well as advantages of the process
                 compared to conventional gas panel fabrication
                 processes.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2330 (Electron tube technology and manufacture);
                 B2380 (Gas discharge tubes and devices); B7260 (Display
                 technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "backfill; degas; display devices; electron tube
                 manufacture; equipment construction; fabrication; gas
                 panel assembly; gas panel displays; gas-discharge;
                 purified Penning gas mixture; sea; single thermal
                 cycle; tipoff; tubes",
  treatment =    "P Practical",
}

@Article{Hammer:1978:OGP,
  author =       "Robert Hammer",
  title =        "Obtaining Gas Panel Metallization Patterns by Vacuum
                 Deposition Through Rib-Supported Mask Structures",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "601--606",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Gas discharge display panel metallization patterns
                 have been obtained directly in a single vacuum
                 deposition step through rib-supported mask structure.
                 This approach provides a simple alternative to
                 screening or photoetching. The rib-supported structures
                 were developed to solve problems of fabricating masks
                 containing long and narrow closely spaced apertures,
                 poorly supported cantilever sections, and free-standing
                 islands. The design of these structures minimize
                 shadowing from support ribs by using non-line-of-sight
                 deposition techniques. Made out of graphite to avoid
                 chemical attack during cleaning operations and
                 fabricated by air abrasion machining, the
                 self-supported masks are held in intimate
                 mask-to-substrate contact during vacuum deposition by
                 an electrostatic hold-down technique.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520F (Vapour deposition); B2330 (Electron tube
                 technology and manufacture); B2380 (Gas discharge tubes
                 and devices); B7260 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air abrasion machining; design; display devices;
                 electron tube manufacture; electrostatic holddown; gas
                 panel display; gas panel metallization patterns;
                 gas-discharge; graphite; masks; metallisation; support
                 ribs; tubes; vacuum deposition",
  treatment =    "A Application; P Practical",
}

@Article{Park:1978:EEG,
  author =       "K. C. Park and E. J. Weitzman",
  title =        "{E}-Beam Evaporated Glass and {MgO} Layers for Gas
                 Panel Fabrication",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "607--612",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An electron-beam evaporation process has been
                 developed that is capable of depositing stable, thick,
                 borosilicate glass films (0.5-50 $\mu$ m) on various
                 substrates at a rate exceeding 0.5 $\mu$ m/min. A very
                 low stress of 4-10 multiplied by 10**7 N/m**2 in
                 compression was obtained in freshly deposited glass
                 films, and a further reduction below measurable levels
                 of stress was observed after a thermal annealing at 500
                 degree C. The effects of evaporation parameter
                 variation and thermal annealing on the film properties
                 of the borosilicate glass layers, as well as the MgO
                 secondary emission layers employed in the fabrication
                 of gas discharge display panels, are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520F (Vapour deposition); B2330 (Electron tube
                 technology and manufacture); B2380 (Gas discharge tubes
                 and devices); B7260 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "borosilicate glass films; borosilicate glasses;
                 deposition; display devices; display panels; electron
                 beam; electron beam evaporation; electron tube
                 manufacture; fabrication; gas discharge; gas panel
                 displays; gas-discharge tubes; magnesium compounds;
                 MgO; secondary emission layers; stress; thermal
                 annealing",
  treatment =    "A Application; P Practical",
}

@Article{OHanlon:1978:EOC,
  author =       "John F. O'Hanlon and K. C. Park and A. Reisman and R.
                 Havreluk and J. G. Cahill",
  title =        "Electrical and Optical Characteristics of
                 Evaporable-Gas-Dielectric {AC} Gas Display Panels",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "613--621",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The characteristics are presented of a prototype gas
                 display panel fabricated with electron-beam deposited
                 dielectric films. It is shown that panels with a 6-
                 $\mu$ m-thick dielectric layer and a 0.2- $\mu$ m-thick
                 MgO layer exhibit short stabilization times (15 min),
                 long life (20,000 h), small drift effects (less than
                 0.5 V), and adequate brightness (21 cd/m**2). The
                 devices have a large dynamic write margin (greater than
                 10 V) over a wide pressure range. Dielectric glass
                 layers as thin as 3.2 $\mu$ m were found to be stable.
                 A panel with a small H$_2$O impurity concentration was
                 used to show that the hydrated MgO surface caused
                 charge leakage and loss of memory margin, while a panel
                 with an air leak confirmed that the surface saturated
                 before the effects of gas contamination were
                 observed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520F (Vapour deposition); B2330 (Electron tube
                 technology and manufacture); B2380 (Gas discharge tubes
                 and devices); B7260 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas display panels; borosilicate glasses;
                 brightness; charge leakage; deposition; display
                 devices; drift effects; dynamic write margin;
                 electrical characteristics; electron beam; electron
                 beam deposition; evaporable glass dielectric; gas panel
                 displays; gas-discharge tubes; long life; loss of
                 memory margin; optical characteristics; prototype;
                 stabilization times",
  treatment =    "P Practical",
  xxtitle =      "Electrical and optical characteristics of
                 evaporable-glass-dielectric {AC} gas display panels",
}

@Article{Ahearn:1978:ERG,
  author =       "W. E. Ahearn and O. Sahni",
  title =        "Effect of Reactive Gas Dopants on the {MgO} Surface in
                 {AC} Plasma Display Panels",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "622--625",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental results are presented for the influence
                 of controlled levels of important reactive impurities
                 (N$_2$, O$_2$, H$_2$O, CO$_2$) on the aging
                 characteristics of the operating voltages of AC plasma
                 display panels. Details are also given of a novel
                 method of modifying the electronic properties of MgO
                 surfaces by discharge processing in an oxygen-doped
                 Ne-0.1\% Ar Penning mixture.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2330 (Electron tube technology and manufacture);
                 B2380 (Gas discharge tubes and devices); B7260 (Display
                 technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC plasma display panels; ageing; ageing
                 characteristics; discharge; display devices; gas panel
                 displays; gas-discharge tubes; impurities; MgO
                 surfaces; operating voltages; Penning mixture;
                 processing; reactive; reactive gas dopants",
  treatment =    "P Practical; X Experimental",
}

@Article{OHanlon:1978:PSA,
  author =       "John F. O'Hanlon",
  title =        "Phenomenological Study of {AC} Gas Panels Fabricated
                 with Vacuum-Deposited Dielectric Layers",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "626--633",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Results are presented of an experimental investigation
                 of AC gas display panel parameters. The ignition and
                 extinction voltages were measured for panels filled
                 with Ne-0.1\% Ar gas to pressures ranging from 0.75
                 multiplied by 10**4 Pa to 8 multiplied by 10**4 Pa (50
                 torr to 600 torr). The panels were constructed with
                 chamber spacings, d, of 0.56 multiplied by 10** minus
                 **2 cm to 2 multiplied by 10** minus **2 cm, and
                 electrode widths, x, of 1.5 multiplied by 10** minus
                 **3 cm to 0.1 cm. Scaling of the Paschen minimum was
                 not found to hold for the narrowest chamber spacing.
                 The dependence of ignition voltage on linewidth is
                 found to be proportional to exp (minus 1.6 x/d) for
                 (x/d) less than 1. An electron diffusion process was
                 invoked to explain this behavior.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520F (Vapour deposition); B2330 (Electron tube
                 technology and manufacture); B2380 (Gas discharge tubes
                 and devices); B7260 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas panels; chamber; display devices; electron
                 diffusion process; electron tube testing; extinction
                 voltages; gas panel displays; gas-discharge tubes;
                 ignition voltage; Paschen minimum; spacing; vacuum
                 deposited coatings; vacuum deposited dielectric
                 layers",
  treatment =    "X Experimental",
}

@Article{Schlig:1978:CVC,
  author =       "E. S. Schlig and G. R. {Stilwell, Jr.}",
  title =        "Characterization of Voltage and Charge Transfer in
                 {AC} Gas Discharge Displays",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "634--640",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "New techniques have been applied to the
                 characterization of voltage and charge transfer in AC
                 gas discharge display cells. This study presents a new
                 method of measuring the voltage transfer curve and
                 several aspects of the operation of the cells which are
                 revealed by these measurements. In the steady sustain
                 region the voltage transfer is nearly equal to the
                 initial gas voltage. Over most of the voltage transfer
                 curve, the voltage transferred is independent of the
                 history and operating environment of the test cell. On
                 the other hand, the charge transfer does depend upon
                 these factors. The voltage and charge transferred vary
                 differently with the initial gas voltage, so the
                 effective wall capacitance depends upon the initial
                 wall voltage as well as on history and environment.
                 This is attributed to the dependence of the lateral
                 spread of the discharge upon its strength.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2380 (Gas discharge tubes and devices); B7260
                 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas discharge displays; capacitance; charge
                 transfer; display devices; effective wall; electron
                 tube testing; gas panel displays; gas-discharge tubes;
                 history; lateral spread; operating environment; voltage
                 transfer curve",
  treatment =    "P Practical",
}

@Article{Lanza:1978:NCC,
  author =       "C. Lanza and O. Sahni",
  title =        "Numerical Calculation of the Characteristics of an
                 Isolated {AC} Gas Discharge Display Panel Cell",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "641--646",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Device characteristics calculated from a
                 one-dimensional dynamic simulation, incorporating space
                 charge effects, of the gaseous discharge occurring at
                 an isolated cell of an AC gas discharge panel are
                 presented. The theoretical model shows all the
                 qualitative features associated with plasma panels, and
                 the quantitative agreement with experimental data
                 inspires confidence in the general validity of the
                 method.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2315 (Gas discharges); B2380 (Gas discharge tubes and
                 devices); B7260 (Display technology and systems)",
  classification = "722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC gas discharge display panel; charge; charge
                 effects; device characteristics; display devices;
                 dynamic simulation; gas panel displays; gas-discharge
                 tubes; isolated cell; numerical calculation; panels;
                 plasma; simulation; space; theoretical model",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Brusic:1978:AAG,
  author =       "V. Brusic and F. M. d'Heurle and R. D. MacInnes and E.
                 I. Alessandrini and J. J. Dempsey and J. Angilello and
                 M. Sampogna",
  title =        "{Al-Cu} Alloy for Gas Panels",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "647--657",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The composition, phase formation, stress, resistivity,
                 and, in particular, the oxidation and corrosion
                 behavior of Cu-Al films with a variety of Cu:Al ratios
                 have been determined. Their relevance to the gas panel
                 is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0530 (Metals and alloys (engineering materials
                 science)); B2330 (Electron tube technology and
                 manufacture); B2380 (Gas discharge tubes and devices);
                 B7260 (Display technology and systems)",
  classification = "541; 544; 722; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al-Cu alloy; aluminium alloys; aluminum copper alloys;
                 composition; copper alloys; corrosion; Cu-Al films;
                 display devices; electronic conduction in metallic thin
                 films; gas panel; gas panel displays; gas-discharge;
                 oxidation; phase formation; resistivity; stress;
                 tubes",
  treatment =    "A Application",
}

@Article{Chow:1978:CSW,
  author =       "F. I. Chow and P. A. Engel and D. C. Heath and S.
                 Lawphongpanich",
  title =        "Contact Stress and Wear Study for Type Characters",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "658--667",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "To ensure the structural integrity of solid print
                 characters subjected to millions of stress cycles, the
                 contact stresses encountered in service must be known.
                 Various type geometries are explored for their
                 influence on stress distribution. A linear programming
                 method of stress analysis is adopted. Experimental
                 analysis and wear characteristics are considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1180 (Optimisation techniques); C3350L (Control
                 applications in printing and associated industries);
                 C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment --- Printers; contact
                 stresses; linear programming; printers; stress
                 analysis; stress distribution; structural integrity;
                 type characters; type geometries; typewriters; wear;
                 wear characteristics",
  treatment =    "P Practical",
}

@Article{Bayer:1978:MWR,
  author =       "R. G. Bayer",
  title =        "Mechanism of Wear by Ribbon and Paper",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "668--674",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "While wear by materials such as ribbon and paper
                 represents a significant and identifiable problem in
                 the business machine industry, it has received little
                 attention in the wear literature. The results of a
                 study into the nature of the wear processes involved
                 and the various factors which influence them are
                 presented. A significant result of that study is the
                 conclusion that the basic wear processes for both
                 materials are similar, i.e., abrasion by small hard
                 particles as compared to an adhesive mechanism for
                 paper as proposed by some in the literature.",
  acknowledgement = ack-nhfb,
  classification = "722",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment",
}

@Article{Polleys:1978:WFH,
  author =       "R. W. Polleys",
  title =        "Work-Hardening of Ferrite Head Surfaces by Wear with
                 Flexible Recording Media",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "675--680 (or 676--680??)",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The ferrite surfaces of rotating magnetic heads were
                 found to have been work-hardened to different degrees
                 depending upon the abrasiveness of the flexible
                 recording media used. For the more abrasive tape, the
                 work-hardening was less than for the less abrasive
                 tape. Associated with the increase in microhardness was
                 decreased signal read-back and increased incidence of
                 surface ``pull-outs''. These phenomena may be
                 understood in the context of fracture mechanics where
                 residual stress, resulting from plastic deformation of
                 the ferrite, is predominant in the wear mechanism.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3110E (Ferrites and garnets); B3120B (Magnetic
                 recording)",
  classification = "722",
  corpsource =   "IBM General Products Div., Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abrasiveness; data storage, magnetic; ferrite devices;
                 ferrite head surfaces; flexible recording media;
                 fracture mechanics; hardening; internal stresses;
                 magnetic heads; magnetic recording heads;
                 microhardness; plastic deformation; residual stress;
                 rotating magnetic heads; surface; wear; work
                 hardening",
  treatment =    "X Experimental",
}

@Article{Roshon:1978:EDC,
  author =       "D. D. Roshon",
  title =        "Electroplated Diamond-Composite Coatings for Abrasive
                 Wear Resistance",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "681--686",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Electroplated diamond-composite coatings are described
                 which are capable of attaining wear resistance a number
                 of orders of magnitude greater than conventional
                 materials when subjected to abrasion by paper. The
                 coatings consist of a single layer of diamond particles
                 held in a matrix of electroplated metal. During the
                 course of these studies, many parameters were found to
                 play important roles in the wear resistance. These
                 parameters include the diamond particle size, its size
                 distribution, the particle density, particle shape,
                 plating uniformity, and the properties of the matrix
                 metal. The influence of these variables is discussed,
                 and the results of the wear testing are presented. The
                 plating process is also briefly described.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8120J (Preparation of dispersion-,fibre-, and
                 platelet-reinforced metal-based composites); A8140P
                 (Friction, lubrication, and wear)",
  classification = "421",
  corpsource =   "IBM System Products Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abrasion; abrasion by paper; abrasive wear resistance;
                 coatings; composite materials; diamond; diamond
                 particles; electroplated; matrix of electroplated
                 metal; particle; particle density; particle shape;
                 particle size; plating process; plating uniformity;
                 protective coatings; size; size distribution; wear of
                 materials --- Protective Coatings; wear resistant
                 coatings; wear testing",
  treatment =    "P Practical",
}

@Article{Phillips:1978:CEE,
  author =       "A. {Phillips, Jr.}",
  title =        "Calculations of the Effect of Emitter Compensation on
                 $\beta$ and $f_t$ of Bipolar Devices",
  journal =      j-IBM-JRD,
  volume =       "22",
  number =       "6",
  pages =        "687--689",
  month =        nov,
  year =         "1978",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Significant increases in bipolar device beta and f$_T$
                 are predicted when emitter compensation is reduced. The
                 prediction was made after accurately calculating all
                 room temperature device parameters with a bipolar
                 device program. The use of empirical
                 concentration-dependent energy gap values allowed the
                 accurate device calculation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors)",
  classification = "714",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amplification; beta; bipolar devices; bipolar
                 transistors; compensation; emitter compensation;
                 energy; energy gap; f/sub T/; gap; semiconductor device
                 models; transistors, bipolar",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Keller:1979:EPR,
  author =       "John H. Keller and William B. Pennebaker",
  title =        "Electrical Properties of {RF} Sputtering Systems",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "3--15",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A theory is developed that gives a relatively complete
                 electrical characterization of RF sputtering systems.
                 Three types of systems are analyzed: tuned substrate,
                 driven substrate, and controlled area ratio of
                 electrode (CARE) systems. The theory is applicable to
                 any of these systems that do not use magnetic fields to
                 confine the plasma. Given the input RF power and
                 voltage at the target, and any other parameters that
                 can be specified as independent variables. The theory
                 provides explicit values for all DC and RF electrical
                 parameters of system. The DC bias developed at the
                 substrate is explained and related to the resputtering
                 energy. In addition, an approximate calculation is
                 presented for the ion density in the plasma; this
                 calculation allows a semiquantitative estimate of the
                 RF voltage developed at the target for a given value of
                 RF input power. It also shows the influence of pressure
                 and frequency on RF sputtering system operation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8115C (Deposition by sputtering); B0520F (Vapour
                 deposition)",
  classification = "539",
  corpsource =   "Data Systems Div., IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "controlled area ratio of; DC bias; driven substrate;
                 electrical characterization; electrode; ion density;
                 plasma density; plasma theory; radiofrequency
                 sputtering; resputtering energy; RF sputtering systems;
                 sputtering; substrate; tuned",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pennebaker:1979:ISI,
  author =       "William B. Pennebaker",
  title =        "Influence of Scattering and Ionization on {RF}
                 Impedance in Glow Discharge Sheaths",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "16--23",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The effects of scattering and ionization on the RF
                 impedance of a glow discharge sheath are calculated
                 using an equivalent DC sheath model. The effects of
                 scattering are treated in terms of a drag force;
                 equilibrium between the ion drift velocity and field is
                 not required. The ratio of first ionization coefficient
                 to pressure, alpha / rho, is assumed to be constant,
                 and the ion energy and ion current injected from the
                 glow are assumed as initial parameters. The results of
                 this calculation, obtained by numeric integration, can
                 be accurately approximated by an interpolation formula.
                 This formula provides a simple means for calculating
                 the RF impedance of a sheath.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5220H (Atomic, molecular, ion and heavy particle
                 collisions in plasma); A5240K (Plasma sheaths); A5280H
                 (Glow and corona discharges); B2315 (Gas discharges)",
  classification = "539; 701",
  corpsource =   "Res. Div., IBM Corp., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "collision processes; equivalent DC sheath; glow
                 discharge sheaths; glow discharges; interpolation;
                 interpolation formula; ionisation of gases; ionization;
                 model; plasma; plasma sheaths; RF impedance;
                 scattering; sputtering",
  treatment =    "T Theoretical or Mathematical",
  xxtitle =      "Influence of scattering and ionization on {RF}
                 impedance of glow discharge sheaths",
}

@Article{Keller:1979:SPM,
  author =       "John H. Keller and Royce G. Simmons",
  title =        "Sputtering Process Model of Deposition Rate",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "24--32",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model of the sputtering process has been developed
                 that predicts the deposition rate of a sputtering
                 system with parallel-plate geometry. By using data for
                 sputtering yield vs voltage obtained from an ion-beam
                 sputtering system, the model applies a new theory for
                 computing the backscatter of the sputtered material,
                 and, from the results, predicts deposition rates. The
                 model also considers the effects of charge exchange in
                 the sheaths, and of re-emission of sputtered material
                 at the substrate. The model is valid for magnetic,
                 tuned substrate, driven substrate, and controlled area
                 ratio diode systems. Comparison with observed
                 deposition rates shows good agreement for clean
                 systems. An experimental APL program that uses the
                 model has been written.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5240K (Plasma sheaths); A5265 (Plasma simulation);
                 A8115C (Deposition by sputtering); B0520F (Vapour
                 deposition); C7410D (Electronic engineering
                 computing)",
  classification = "539",
  corpsource =   "Data Systems Div., IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL program; backscatter; charge; charge exchange;
                 controlled area ratio diode; deposition rate; driven;
                 driven substrate; electronic engineering computing;
                 exchange; modelling; particle backscattering; plasma
                 sheaths; sheaths; sputtering; sputtering process model;
                 sputtering system; substrate; tuned substrate",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Coburn:1979:SCA,
  author =       "John W. Coburn and Eric Kay",
  title =        "Some Chemical Aspects of the Fluorocarbon Plasma
                 Etching of Silicon and its Compounds",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "33--41",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Mass spectrometric sampling of fluorocarbon glow
                 discharges and in situ measurements of the etch rate of
                 Si and SiO$_2$ with quartz crystal microbalances have
                 been used to provide additional insight concerning the
                 chemistry involved when additive gases such as O$_2$,
                 H$_2$, N$_2$, H$_2$O,and C$_2$F$_4$ are injected into a
                 CF$_4$ glow discharge. The results indicate that the
                 etching behavior of the discharge is not significantly
                 influenced by the molecular structure of the injected
                 gas molecules but is determined primarily by the
                 elemental composition of the glow discharge. This
                 phenomenologically observed result can be used to
                 predict qualitatively the relative etching behavior of
                 a large class of gaseous etchant mixtures as well as
                 the role of various electrode or wall materials in the
                 plasma etching process.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5280H (Glow and corona discharges); A8280M (Mass
                 spectrometry (chemical analysis)); B2315 (Gas
                 discharges); B2550E (Surface treatment for
                 semiconductor devices)",
  classification = "714; 932",
  corpsource =   "Res. Div., IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "C/sub 2/F/sub 4/; chemistry; etch rate; etching;
                 fluorocarbon glow discharges; gaseous etchant; glow
                 discharges; H/sub 2/; H/sub 2/O; mass spectroscopic
                 chemical analysis; mixtures; N/sub 2/; O/sub 2/; plasma
                 etching process; plasmas; quartz crystal microbalances;
                 reactive ion etching; semiconductor device manufacture;
                 Si; silicon; silicon compounds; SiO/sub 2/; sputter
                 etching",
  treatment =    "A Application; X Experimental",
}

@Article{Pacansky:1979:PDM,
  author =       "Jacob Pacansky and James R. Lyerla",
  title =        "Photochemical Decomposition Mechanisms for Az-Type
                 Photoresists",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "42--55",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The photochemical decomposition mechanism of
                 orthonaphthoquinonediazides has been investigated
                 principally by infrared and carbon-13 nuclear magnetic
                 resonance spectroscopies. The results demonstrate that
                 the decomposition proceeds via a ketene intermediate to
                 a photoproduct, the nature of which depends on the
                 reaction conditions. Model resist systems were prepared
                 by mixing orthonaphthoquinonediazides and
                 2,3,6-trimethylphenol or the diazide plus Novolak
                 resin. Under ambient thermal and humidity conditions,
                 ultraviolet (UV) exposure of the diazide yields
                 3-indenecarboxylic acid as the final photoproduct.
                 However, UV exposure in vacuo results in ester
                 formation via a ketene-phenolic OH reaction. The
                 decomposition pathway and ensuing reactions have been
                 shown to be the same for both 1- and
                 3-orthonaphthoquinonediazides attached to mono-and
                 trihydroxybenzophenones. The technological implications
                 for resist processing derived from these studies are
                 also discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques)",
  classification = "713",
  corpsource =   "Res. Div., IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "decomposition mechanisms; ester formation; exposure;
                 infrared spectra of organic molecules and substances;
                 integrated circuit manufacture;
                 orthonaphthoquinonediazides; photochemical; photolysis;
                 photoproduct; photoresists; radiofrequency and
                 microwave; spectra of organic molecules and substances;
                 ultraviolet",
  treatment =    "X Experimental",
  xxtitle =      "Photochemical decomposition mechanisms for {AX-type}
                 photoresists",
}

@Article{Blumentritt:1979:APT,
  author =       "Bruce F. Blumentritt",
  title =        "Annealing of Poly(Ethylene Terephthalate)-Film-Based
                 Magnetic Recording Media for Improved Dimensional
                 Stability",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "56--65",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "PET-film-based magnetic recording media are subject to
                 a number of dimensional instabilities, a major one
                 being in-plane shrinkage due to stress relaxation in
                 the biaxially oriented substrate. Annealing the media
                 allows stress relaxation without significantly
                 degrading other properties and makes possible the use
                 of higher track densities. Effects of annealing on
                 mechanical properties, coefficients of thermal and
                 hygroscopic expansion, and long-term dimensional
                 stability of the media are described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0560 (Polymers and plastics (engineering materials
                 science))B3120B (Magnetic recording); C5320C (Storage
                 on moving magnetic media)",
  classification = "722; 817",
  corpsource =   "General Systems Div., IBM Corp., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealed polymers; annealing; data storage, magnetic;
                 dimensional; expansion; hygroscopic expansion; magnetic
                 recording; magnetic recording media; mechanical
                 properties; poly(ethylene terephthalate) film;
                 polyethylenes --- Film; polymer films; shrinkage;
                 stability; stress relaxation; thermal; thermal
                 expansion",
  treatment =    "A Application",
}

@Article{Blumentritt:1979:LFI,
  author =       "Bruce F. Blumentritt",
  title =        "Laminated Films with Isotropic In-Plane Properties",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "66--74",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Commercially available polymer films used in
                 structural applications, such as biaxially oriented
                 poly(ethylene terephthalate), exhibit pronounced
                 anisotropy in mechanical properties, thermal expansion,
                 and long-term dimensional stability. Films with more
                 nearly isotropic in-plane properties have been produced
                 by laminating plies of PET film at various angles to
                 one another. In addition, composite films have been
                 made with nearly isotropic properties and with
                 significantly reduced coefficients of expansion
                 compared to those of commercially available polymer
                 films. A laminate with PET faces bonded to a low
                 expansion alloy foil core had the best dimensional
                 stability and the least anisotropy of the films
                 studied.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0560 (Polymers and plastics (engineering materials
                 science))B3120B (Magnetic recording); C5320C (Storage
                 on moving magnetic media)",
  classification = "722; 817",
  corpsource =   "General Systems Div., IBM Corp., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alloy foil core; data storage, magnetic --- Disk;
                 dimensional; isotropic inplane properties; laminate;
                 laminates; magnetic recording; mechanical properties;
                 plastics laminates; poly(ethylene; polymer films;
                 stability; terephthalate) films; thermal expansion",
  treatment =    "X Experimental",
}

@Article{Franaszek:1979:FBC,
  author =       "Peter A. Franaszek",
  title =        "On Future-Dependent Block Coding for Input-Restricted
                 Channels",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "75--81",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A29",
  MRnumber =     "80h:94019",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Consider a restricted channel whose constraints may be
                 characterized by a finite state machine model.
                 Conventional coding techniques for such channels result
                 in codes where the choice of a word to be transmitted
                 is only a function of the current state and the
                 information to be represented by this word. This paper
                 develops techniques for constructing codes where the
                 code word choice may also depend on future information
                 to be transmitted. it is shown that such
                 future-dependent codes exist for channels and coding
                 rates where no conventional code may be constructed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  classification = "716; 718; 723",
  corpsource =   "Res. Div., IBM Corp., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "codes, symbolic; communication channels; digital
                 communication systems; encoding; finite state machine
                 model; future dependent block coding; information
                 theory; input restricted channels",
  reviewer =     "Robert Gray",
}

@Article{Ahuja:1979:ACN,
  author =       "Vijay Ahuja",
  title =        "Algorithm to Check Network States for Deadlock",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "82--86",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of checking the states of a system for
                 deadlock is treated for a single class of systems, or
                 networks, and for a single class of resources, or
                 buffers. An algorithm is described that, for a given
                 state, requires O left bracket m plus n**2 right
                 bracket operations, where m and n are, respectively,
                 the number of tasks and nodes in the state.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques)",
  classification = "723",
  corpsource =   "System Communications Div., IBM Corp., Research
                 Triangle Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; computer networks; computers; deadlock;
                 network state checking",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bogy:1979:BLJ,
  author =       "David B. Bogy",
  title =        "Break-Up of a Liquid Jet: Second Perturbation Solution
                 for One-Dimensional {Cosserat} Theory",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "1",
  pages =        "87--92",
  month =        jan,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The second perturbation solution is derived within the
                 nonlinear one-dimensional Cosserat theory for a liquid
                 jet emanating from a nozzle with harmonic excitation.
                 Numerical results are presented for parameters relevant
                 to ink-jet printing technology. Satellite drops are
                 predicted but always in the backward merging condition.
                 The results are compared with the corresponding
                 solution obtained by W. T. Pimbley and H. C. Lee, who
                 used a different one-dimensional set of equations with
                 a different formulation of the problem and obtained
                 forward merging satellite drops under some
                 conditions.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4755C (Jets in fluid dynamics); A4755E (Nozzles);
                 C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "Univ. of California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "backward merging; computer peripheral equipment;
                 dimensional Cosserat theory; excitation; harmonic; ink;
                 ink-jet printing; inkjet printing; jet breakup; jets;
                 liquid jet; merging; nonlinear one; nozzle; nozzles;
                 perturbation techniques; printing; satellite drops;
                 second perturbation solution",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chance:1979:HPP,
  author =       "Dudley A. Chance and Jean-Claude A. Chastang and V. S.
                 Crawford and Richard E. Horstmann and R. O. Lussow",
  title =        "{HeNe} Parallel Plate Laser Development",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "108--118",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A parallel plate format is used for fabricating
                 ``hard'' sealed HeNe lasers. The new packaging geometry
                 and construction process are suitable for large scale
                 manufacturing. Cut plate, molded plate, and folded beam
                 lasers have been built and tested. Several changes from
                 conventional lasers, such as evaporated film cathode
                 and anode, square cross section bore, glass sealed
                 Brewster windows, and ``soft'' glass bore materials,
                 are discussed. The power output capability,
                 measurements of gain and loss parameters, and the
                 reliability of these lasers are also considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4260B (Design of specific laser systems); B4320C (Gas
                 lasers); B4320M (Laser accessories and
                 instrumentation)",
  classification = "744",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "construction; cut plate; evaporated film anode;
                 evaporated film cathode; folded beam lasers; gain; gas
                 lasers; glass bore materials; glass sealed Brewster
                 windows; He-Ne lasers; laser accessories; lasers ---
                 Testing; lasers, gas; loss; molded; packaging; parallel
                 plate; plate; power output; reliability",
  treatment =    "P Practical",
}

@Article{Chance:1979:CHL,
  author =       "Dudley A. Chance and Vlosta Brusic and V. S. Crawford
                 and Robert D. Macinnes",
  title =        "Cathodes for {He-Ne} lasers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "119--127",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Vapor deposited aluminum cathodes for parallel plate
                 HeNe lasers have been used with considerable success.
                 It is shown that the aluminum cold cathode is improved
                 by the addition of copper and that other alloying
                 elements of bulk Al2024 do not contribute to cathode
                 performance. The plasma oxidation process of Hochuli
                 improves cathode performance by cleaning the surface
                 and optimizing the oxide film for maximum efficiency.
                 There appears to be a trade-off between life and
                 electron tunneling efficiency for optimum oxide
                 thickness. Auger electron spectroscopy, ellipsometry,
                 and scanning electron microscopy are the techniques
                 used for surface characterization.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4260B (Design of specific laser systems); B4320C (Gas
                 lasers); B4320M (Laser accessories and
                 instrumentation)",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accessories; Al-Cu alloys; aluminium alloys; Auger
                 electron spectroscopy; cathode; cathodes; cleaning;
                 coatings; cold cathode; copper alloys; efficiency;
                 electron tunneling efficiency; ellipsometry; film; gas
                 lasers; He-Ne lasers; laser; laser accessories; lasers,
                 gas; oxide; oxide coated; oxide coated cathodes; plasma
                 oxidation process; scanning electron microscopy;
                 thickness; vapour deposited; vapour deposited
                 coatings",
  treatment =    "P Practical; X Experimental",
}

@Article{Ahearn:1979:NAH,
  author =       "William E. Ahearn and Richard E. Horstmann",
  title =        "Nondestructive Analysis for {HeNe} Lasers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "128--131",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The methods used to measure the gas properties in
                 sealed helium-neon lasers are described. Such
                 parameters as total gas pressure, minor constituent
                 concentration (i.e., He\slash Ne ratio), and gas purity
                 can be measured using spectral emission methods. How
                 these parameters and measurement techniques relate to
                 the electrical operating characteristics of the laser
                 is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255F (Inert gas lasers); A4260 (Laser systems and
                 laser beam applications); A8280D (Electromagnetic
                 radiation spectrometry (chemical analysis)); B4320C
                 (Gas lasers); B4320M (Laser accessories and
                 instrumentation)",
  classification = "744; 801",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atomic emission spectroscopy; chemical analysis;
                 concentration; electrical; gas lasers; gas pressure;
                 gas purity; gases, inert --- Spectroscopic Analysis;
                 He-Ne lasers; lasers, gas; measurement; nondestructive;
                 nondestructive analysis; operating characteristics;
                 spectral emission; testing",
  treatment =    "P Practical",
}

@Article{Chastang:1979:PPP,
  author =       "Jean-Claude A. Chastang",
  title =        "Polarization Problems of Parallel Plate Lasers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "132--139",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Parallel plate laser technology requires that the
                 plasma envelope and particularly the Brewster windows
                 be ``hard sealed.'' The first part of this study
                 reports the effects of misalignments of the Brewster
                 windows on laser performance. This turned out not to be
                 a serious problem. In the second part, the increase in
                 the birefringence of the Brewster windows resulting
                 from the hard seal technique is examined. It is found
                 that this problem, which is serious, can be eliminated
                 by careful control of the temperature during sealing
                 and the annealing process.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4260B (Design of specific laser systems); B4320M
                 (Laser accessories and instrumentation)",
  classification = "744",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealing; birefringence; Brewster windows; hard seal
                 technique; laser accessories; lasers; misalignments;
                 parallel plate lasers; plasma envelope; polarisation;
                 sealing; seals (stoppers); temperature control",
  treatment =    "P Practical; X Experimental",
}

@Article{Franaszek:1979:RSF,
  author =       "Peter A. Franaszek and James P. Considine",
  title =        "Reduction of Storage Fragmentation on Direct Access
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "140--148",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A technique is described for partially reorganizing
                 the contents of disk storage so as to reduce the level
                 of fragmentation. The method entails choosing that
                 fraction of the contents which is estimated to have the
                 greatest impact on the free space distribution,
                 followed by the relocation of these data to more
                 favorable locations, subject to the system integrity
                 requirements.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C6120 (File
                 organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access storage; data storage, magnetic; direct access
                 storage; disc storage; file organisation; free space
                 distribution; magnetic; magnetic disc and drum storage;
                 memory hierarchy; random-; storage fragmentation",
  treatment =    "P Practical",
}

@Article{Rissanen:1979:AC,
  author =       "Jorma J. Rissanen and Glen G. {Langdon, Jr.}",
  title =        "Arithmetic Coding",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "149--162",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94B40",
  MRnumber =     "81j:94024",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The earlier introduced arithmetic coding idea has been
                 generalized to a very broad and flexible coding
                 technique which includes virtually all known variable
                 rate noiseless coding techniques as special cases. An
                 outstanding feature of this technique is that alphabet
                 extensions are not required. A complete decodability
                 analysis is given. The relationship of arithmetic
                 coding to other known nonblock codes is illuminated.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  classification = "716; 723",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arithmetic coding; block codes; codes; codes,
                 symbolic; decodability analysis; encoding; information
                 theory --- Bandwidth Compression; nonblock codes;
                 variable rate noiseless coding",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Weinberger:1979:HPL,
  author =       "Arnold Weinberger",
  title =        "High-Speed Programmable Logic Array Adders",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "163--178",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Programmable Logic Array (PLA) adders are described
                 which perform an addition in one cycle with a single
                 pass through a PLA and require a reasonable number of
                 product terms for an 8-, 16-, or even a 32-bit adder.
                 The PLA features two-bit input decoders feeding an AND
                 array followed by an OR array whose outputs are
                 pairwise Exclusive-ORed. Carry-look-ahead adder
                 equations, adapted to the PLA to require relatively few
                 product terms, are adjusted for maximum sharing of
                 product terms. The number of unique product terms is a
                 relative measure of one of the physical dimensions of
                 the PLA. Equations for contiguous sum bits are grouped
                 into strings, each using a common input carry. A
                 procedure optimally assigns sum bits to strings to
                 further minimize the total number of unique product
                 terms. The methods are extended to PLAs with decoders
                 of increased inputs and substantially reduced product
                 terms. They can serve as dedicated macro functions on a
                 chip, using special decoders relevant to adders. As a
                 result, the other PLA dimension comprising the number
                 of outputs from all input decoders increases only
                 moderately, and can even decrease, with larger
                 decoders. Finally, the PLA adder can be further
                 substantially compressed by splitting the OR array into
                 two parts such that a row of the AND array is shared
                 between two product terms, and an OR array column is
                 shared between two sums of product terms.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); C5120 (Logic and switching
                 circuits)C5230 (Digital arithmetic methods)",
  classification = "721; 722",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adders; cellular arrays; computers; design; high speed
                 adder; logic; logic design; programmable logic array
                 adder",
  treatment =    "P Practical",
}

@Article{Chen:1979:TSB,
  author =       "William T. Chen and Carl W. Nelson",
  title =        "Thermal Stress in Bonded Joints",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "179--188",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper considers the stress distributions in
                 bonded materials induced by differential expansion or
                 contraction of these materials. The analytical approach
                 is similar to the lap joint theories attributed to
                 Volkersen and expanded by Goland and Reissner. Several
                 simple and typical analytical models are presented to
                 bring out the relative importance of different
                 geometrical and material parameters and to give some
                 insight into different modes in which the bonds might
                 fail.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0150 (Electrical contracting and installation)",
  classification = "714; 913; 944",
  corpsource =   "IBM System Products Div. Lab., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adhesion; analytical models; bonded materials;
                 electron device manufacture; electronic devices; lap
                 joint; modelling; reliability; stress distributions;
                 stresses; thermal; thermal stresses; thermal variables
                 measurement",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Reed:1979:ISA,
  author =       "Martin A. Reed and Terence D. Smetanka",
  title =        "Implications of a Selective Acknowledgment Scheme on
                 Satellite Performance",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "189--196",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The long propagation delay inherent to satellite
                 communications may lead to a degradation in data link
                 response time as compared to the same transmission over
                 purely terrestrial links. Furthermore, data link errors
                 need be considered in any such study of response time
                 of satellite data links. A model has been developed to
                 study data link response time under a selective
                 acknowledgment retransmission protocol. The model not
                 only calculates mean link response time, but also the
                 second moment of the response time. This model is then
                 applied to various interactive data transmission
                 schemes over a half-duplex (HDX) satellite link with
                 terrestrial tails, although modifications can easily be
                 made to analyze pure terrestrial or satellite links.
                 The model parameters include bit error rate (BER),
                 terrestrial as well as satellite propagation delay,
                 modem transit delay, MAXOUT (maximum number of
                 unacknowledged data frames), frame size (bits), and
                 message size (bits).",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210 (Telecommunication applications); B6250G
                 (Satellite relay systems)",
  classification = "716",
  corpsource =   "IBM System Communications Div., Gaithersburg, MD,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bit; data communication systems; data link; data
                 transmission; delay; error rate; frame size; half
                 duplex satellite link; interactive data transmission;
                 message size; model; modelling; modem transit; response
                 time; retransmission protocol; satellite links;
                 satellite propagation delay; selective acknowledgment;
                 selective acknowledgment scheme; telecommunication
                 links, satellite; terrestrial propagation delay;
                 unacknowledged data frames",
  treatment =    "A Application; T Theoretical or Mathematical",
  xxtitle =      "Implications of a selective acknowledgement scheme on
                 satellite performance",
}

@Article{Greenberg:1979:SHI,
  author =       "Hermo J. Greenberg",
  title =        "Study of Head-Tape Interaction in High Speed Rotating
                 Head Recording",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "197--205",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The steady state tape dynamics resulting from the
                 interaction of a high speed rotating head and a
                 flexible recording tape are formulated within the
                 framework of linear shell theory. Tape displacements in
                 the area above the head are coupled with the solution
                 to the Reynolds equation in order to calculate the film
                 thickness (flying height) between head and tape.
                 Simulated results for spherical heads are compared to
                 observed behavior on experimental systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320 (Digital storage)",
  classification = "752",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "dynamics; film thickness; flexible recording tape;
                 heads; high speed rotating head; linear; magnetic
                 heads; magnetic recording; magnetic tape; Reynolds
                 equation; rotating head recording; shell theory;
                 spherical; tape displacement; tape head interface; tape
                 recorders",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Huang:1979:RPM,
  author =       "Ting C. Huang",
  title =        "Rapid and Precise Method for Analysis of Energy
                 Dispersive {X}-Ray Spectra",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "206--213",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new, precise, and rapid method for the analysis of
                 energy dispersive x-ray spectra generated by electron
                 beam or x-ray excitation is presented. It includes the
                 use of Gaussian profiles and a polynomial of I/E (where
                 E is the x-ray energy) to represent the observed x-ray
                 characteristic lines and background, automatic
                 sectioning of the entire spectrum, and a figure of
                 merit to estimate goodness of fit. Details of the
                 method and its programming techniques are given.
                 Results of analyzing complicated energy dispersive
                 X-ray (EDX) spectra of multi-element alloys are
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650D (Data gathering, processing, and recording,
                 data displays including digital techniques); A8280D
                 (Electromagnetic radiation spectrometry (chemical
                 analysis)); C7320 (Physics and chemistry computing)",
  classification = "921; 932",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; computing; curve fitting; energy dispersive
                 X-ray; Gaussian profiles; mathematical models; multi
                 element alloy analysis; polynomial; spectra;
                 spectrochemical analysis; spectroscopy; spectroscopy
                 computing; X-ray chemical analysis; X-ray spectra;
                 X-ray spectrochemical; x-rays",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Dave:1979:CAF,
  author =       "Jitendra V. Dave",
  title =        "Contrast Attenuation Factors for Remote Sensing",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "214--224",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Attenuation factors for the contrast of objects lying
                 on the earth's surface and observed through five
                 different atmospheric models are calculated as a
                 function of the wavelength (0.31-0.9935 $\mu$ m), solar
                 zenith angle, ground reflectivity, and the nadir and
                 azimuth angles of view. The first model is free of
                 aerosols and absorbing gases. Absorption by average
                 amounts of oxygen, ozone, and water vapor is included
                 in the remaining four models. The second model is also
                 free of aerosols, but the last three models contain
                 aerosols in the form of a spherical polydispersion made
                 from a substance with a spectrally independent
                 refractive index of 1.5-0.01 i. Models 3 and 4 are
                 expected to represent, respectively, the average and
                 strong turbid conditions encountered over large
                 continental areas. Models 3 and 5 contain aerosols with
                 different size distribution characteristics, but have
                 the same amount of aerosol mass loading per unit
                 horizontal area. The contrast attenuation factor is
                 found to increase with an increase in wavelength and
                 reflectivity of the surrounding surface, and a decrease
                 in the atmospheric turbidity and gaseous attenuation.
                 It also depicts strong azimuthal dependence especially
                 for models illuminated by low-altitude solar radiation
                 of longer wavelengths.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9265 (Atmospheric optics); A9385 (Instrumentation and
                 techniques for geophysical, hydrospheric and lower
                 atmosphere research); B7710B (Atmospheric, ionospheric
                 and magnetospheric techniques and equipment)",
  classification = "481; 657; 732; 921",
  corpsource =   "IBM Data Processing Sci. Centre, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.31 to 0.9935 microns; absorbing gases; absorption;
                 aerosols; atmospheric; atmospheric models; atmospheric
                 optics; atmospheric techniques; atmospheric turbidity;
                 azimuthal dependence; contrast attenuation factor;
                 earth atmosphere --- Mathematical Models; ground
                 reflectivity; light; light absorption; light
                 scattering; modelling; optics; remote sensing;
                 scattering; solar zenith angle; spherical
                 polydispersion",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Pippenger:1979:ACT,
  author =       "Nicholas Pippenger",
  title =        "On the Application of Coding Theory to Hashing",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "2",
  pages =        "225--226",
  month =        mar,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Quick proofs are given for the characterization (due
                 to Schay, Raver, Hanan, and Palermo) of the collision
                 distance of a linear hashing function and for a dual
                 notion (called the restriction distance), which relates
                 to the accessibility of addresses by sets of keys and
                 the uniform distribution of sets of keys over
                 addresses.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accessibility; codes; codes, symbolic; coding theory;
                 collision distance; data processing --- File
                 Organization; encoding; key to address; keys
                 distribution; linear hashing function; of addresses;
                 transformation",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Stillman:1979:SMB,
  author =       "R. Stillman",
  title =        "Simulation of a Moving Bed Gasifier for a Western
                 Coal",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "240--252",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an adiabatic steady state plug
                 flow model for a moving bed coal gasifier with
                 gas-solid heat transfer. The model considers 17 solid
                 stream components, 10 gas stream components and 17
                 reactions. The kinetic and thermodynamic parameters
                 were derived for a Wyoming subbituminous coal. Examples
                 of calculated results are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B8230 (Thermal power stations and plants)",
  classification = "522; 524; 631",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adiabatic flow; chemically reactive flow; coal; coal
                 gasification; coal gasifier; combustion; flow of fluids
                 --- Analogies; heat transfer; model; modelling; moving
                 bed; simulation; steady state plug flow; subbituminous
                 coal",
  treatment =    "T Theoretical or Mathematical",
}

@Article{McCumber:1979:ACA,
  author =       "W. H. McCumber and M. W. Weston",
  title =        "Analysis and Comparison of Actual to Predicted
                 Collector Array Performances",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "253--269",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Hottel-Whillier-Bliss (HWB) equation has been the
                 standard tool for the evaluation of collector thermal
                 performance for four decades. This paper presents a
                 technique that applies the criteria of ASHRAE Standard
                 93-77 to the determination of the HWB equation
                 coefficients from field-derived data. Results of the
                 analysis of a sample collector array illustrate the
                 technique. Actual dynamic performances of various
                 collector arrays in the field are compared to those
                 predicted by the steady-state efficiency models for the
                 individual panels. In certain cases, the HWB model
                 produces deviations of over 100\% from measured hourly
                 performances and 35\% from measured monthly
                 performances when compared with the single-panel
                 laboratory-derived model. However, when the
                 field-derived HWB model is used as the basis of
                 comparison the performance deviations were typically
                 less than 5\%.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8630R (Thermal energy conversion (heat engines and
                 heat pumps))",
  classification = "657; 702",
  corpsource =   "IBM Federal Systems Div., Huntsville, AL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array; dynamic performances; efficiency models; heat
                 transfer; Hottel Whillier Bliss equation; solar
                 absorber-convertors; solar cells; solar collector;
                 solar radiation --- Collectors",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Ciszek:1979:SSD,
  author =       "T. F. Ciszek and G. H. Schwuttke and K. H. Yang",
  title =        "Solar-Grade Silicon by Directional Solidification in
                 Carbon Crucibles",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "270--277",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Directional solidification of silicon in carbon
                 crucibles was achieved by using two variations of the
                 Bridgman-Stockbarger method. One was a static technique
                 wherein liquid silicon in a carbon crucible was
                 positioned in a temperature gradient of about 35 degree
                 C/cm, with the highest temperature at the top of the
                 crucible. Solidification was achieved by lowering the
                 system temperature at a rate of 4-5 degree C/min. The
                 second technique entailed lowering a silicon-loaded
                 carbon crucible through a fixed-rf coil at a rate of
                 0.55 cm\slash min. Crack-free silicon was produced by
                 both methods. The equilibrium grain structure was
                 initiated by nucleation at the crucible walls, with
                 surviving grains tending to grow in alignment with the
                 temperature gradient to produce an axially columnar
                 grain structure of mainly 110 orientation. The average
                 grain diameter was 0.11 cm; a typical length was 0.7
                 cm. Solar cells made with this material gave an AMI
                 conversion efficiency of 11.4\%.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8110F (Crystal growth from melt); A8630J
                 (Photoelectric conversion; solar cells and arrays);
                 B0510 (Crystal growth); B2550 (Semiconductor device
                 technology); B8420 (Solar cells and arrays)",
  classification = "549; 702",
  corpsource =   "Photovoltaics Branch, Solar Energy Res. Inst., Golden,
                 CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "axially columnar grain structure; Bridgman; C
                 crucible; conversion efficiency; crystal growth from
                 melt; directional solidification; semiconductor growth;
                 semiconductors; silicon; silicon and alloys; solar
                 cells; solar cells --- Manufacture; static technique;
                 Stockbarger method",
  treatment =    "A Application; P Practical",
}

@Article{VanVechten:1979:ERN,
  author =       "J. A. {Van Vechten} and R. J. Gambino and J. J.
                 Cuomo",
  title =        "Encapsulation of Radioactive Noble Gas Waste in
                 Amorphous Alloy",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "278--285",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Public demand for the containment and safe storage of
                 radioactive waste materials has caused the U. S.
                 Government to require that, beginning in January 1983,
                 most of the **8**5Kr, which until now has been vented
                 to the atmosphere during the reprocessing of nuclear
                 fision fuel rods, will have to be captured and retained
                 for several decades. The cost of accomplishing this
                 with present compressed-gas technology is enough to
                 increase the cost of nuclear generated electricity by
                 an estimated 0.3\%. However, materials developed for
                 amorphous magnetic bubble memory devices have been
                 found to be capable of storing large quantities of Kr
                 (30 atomic percent) with great stability up to
                 temperatures above 1070 K. The cost of **8**5Kr storage
                 in the magnetic bubble memory material appears to be
                 less than 1\% of that for present compressed-gas
                 technology.",
  acknowledgement = ack-nhfb,
  classcodes =   "A2842K (Radioactive wastes from fission reactors);
                 A2875 (Radioactive waste, transportation, disposal,
                 storage, treatment); A2880 (Radiation technology,
                 including shielding)B8220B (Nuclear reactors)",
  classification = "622",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "/sup 85/Kr; air pollution control; air pollution
                 detection and control; alloys; amorphous; amorphous
                 alloy; cost; economics; encapsulation; fission reactor
                 materials; industrial wastes; krypton; magnetic bubble
                 memory material; radioactive materials --- Waste
                 Disposal; radioactive waste; radioactive waste storage;
                 state",
  treatment =    "P Practical",
}

@Article{Lorie:1979:ASL,
  author =       "Raymond A. Lorie and Jorgen F. Nilsson",
  title =        "Access Specification Language for a Relational Data
                 Base System",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "286--298",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper addresses the problem of executing high
                 level language queries submitted to a relational data
                 base system. As a step in the process of constructing
                 an ``efficient'' compiler for a high level language the
                 elaboration of an intermediate level language is
                 suggested, acting as a target language for the
                 optimizer part of the compiler. This language may be
                 conceived as one of several levels in a chain of
                 abstract machines mapping a nonprocedural relational
                 language onto primitive data base access operations.
                 The introduction of an access specification language is
                 intended to provide a conceptual platform facilitating
                 the handling of the ``optimization'' problem.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6140D (High level
                 languages); C6150C (Compilers, interpreters and other
                 processors); C6160D (Relational databases)",
  classification = "723",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access specification language; compiler; computer
                 operating systems --- Program Compilers; computer
                 programming languages; data base systems; database
                 management systems; high level language; intermediate
                 level language; language; nonprocedural relational;
                 problem oriented languages; program compilers;
                 relational data base system",
  treatment =    "P Practical",
}

@Article{Blahut:1979:TTE,
  author =       "R. E. Blahut",
  title =        "Transform Techniques for Error Control Codes",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "299--315",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94B05 (94B15)",
  MRnumber =     "80f:94014",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "By using the theory of finite field Fourier
                 transforms, the subject of error control codes is
                 described in a language familiar to the field of signal
                 processing. The many important uses of spectral
                 techniques in error control are summarized. Many
                 classes of linear codes are given a spectral
                 interpretation and some new codes are described.
                 Several alternative encoder\slash decoder schemes are
                 described by frequency domain reasoning. In particular,
                 an errors-and-erasures decoder for A BCH code is
                 exhibited which has virtually no additional
                 computations over an errors-only decoder. Techniques
                 for decoding BCH, RS, and alternant codes (Goppa codes)
                 a short distance beyond the designed distance are
                 discussed. Also, a modification to the definition of a
                 BCH code is described which reduces the decoder
                 complexity without changing the code's rate or minimum
                 distance.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0230 (Integral transforms); B6120B (Codes); C1130
                 (Integral transforms); C6130 (Data handling
                 techniques)",
  classification = "723; 921",
  corpsource =   "IBM Federal Systems Div. Lab., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "BCH code; codes; codes, symbolic; decoder; decoding;
                 encoder; encoding; error control codes; error
                 correction codes; finite field Fourier transforms;
                 Fourier; frequency domain analysis; Goppa codes;
                 linear; mathematical transformations --- Fourier
                 Transforms; RS codes; transforms",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Diaz:1979:ECA,
  author =       "A. F. Diaz and K. K. Kanazawa",
  title =        "Electrodes with Covalently Attached Monolayers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "316--329",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Cyclic and second-harmonic AC voltammetry has been
                 used to study solution and solid state electrochemical
                 reactions on metal oxide surfaces chemically modified
                 with silyl derivatives of the type
                 SnO$_2$/Si(CH$_2$)$_3$NH(CH$_2$)$_x$NR$_1$R$_2$. The R
                 groups studied include pyrazoline derivatives,
                 tetrathiafulvalene, and ferrocene. Electrode effects on
                 solution redox reactions involving phenothiazine and
                 benzoquinone have also been compared using both
                 platinum electrodes and the chemically modified
                 electrodes. The results from the various approaches
                 used consistently indicate that the redox reactions are
                 slower on modified as opposed to unmodified electrode
                 surfaces.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8245 (Electrochemistry and electrophoresis)",
  classification = "539; 702",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "benzoquinone; chemical reactions; chemically;
                 covalently attached monolayers; derivative;
                 electrochemical; electrochemical electrodes;
                 electrochemical reactions; electrochemistry ---
                 Measurements; electrode surfaces; electrodes;
                 ferrocene; metal oxide; modified electrodes;
                 phenothiazine; platinum electrodes; pyrazoline; redox
                 reactions; silyl derivatives;
                 SnO$_2$Si(CH$_2$)3/NH(CH$_2$)$_x$NR$_1$R$_2$; surfaces;
                 tetrathiafulvalene; voltammetry",
  treatment =    "X Experimental",
}

@Article{Freiser:1979:ZFC,
  author =       "M. J. Freiser",
  title =        "On the Zigzag Form of Charged Domain Walls",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "330--338",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Unusual domain walls have been found in ferrofluid
                 patterns on thin film materials with low magnetization
                 that is in or near the plane of the film. These walls
                 carry a net magnetic charge and are characteristically
                 kinked in a regular manner to form a zigzag. A simple
                 account is given of the energetics of such walls whose
                 form follows from a compromise between magnetostatic
                 terms and the energy of anisotropy. It is argued that
                 an array of closure domains at straight edges in these
                 materials should have a boundary of similar character,
                 and these too have been observed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7560C (Magnetic domain walls and domain structure);
                 B3110 (Magnetic materials)",
  classification = "708",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array of closure domains; domain walls; energy of
                 anisotropy; ferrofluid patterns; films; Gd-Co film; ion
                 implanted garnet; magnetic; magnetic charge; magnetic
                 domain walls; magnetic fluids; magnetic materials;
                 magnetic thin films; magnetostatic energy; thin film
                 materials; zigzag form",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Nadas:1979:PP,
  author =       "Arthur Nadas",
  title =        "Probabilistic {PERT}",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "3",
  pages =        "339--347",
  month =        may,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A solution is offered to the problem of determining a
                 probability distribution for the length of the longest
                 path from source (start) to sink (finish) in an
                 arbitrary PERT network (directed acyclic graph), as
                 well as determining associated probabilities that the
                 various paths are critical (``bottleneck
                 probabilities''). It is assumed that the durations of
                 delays encountered at a node are random variables
                 having known but arbitrary probability distributions
                 with finite expected values. The solution offered is,
                 in a certain sense, a worst-case bound over all
                 possible joint distributions of delays for given
                 marginal distributions for delays. This research was
                 motivated by the engineering problem of the timing
                 analysis of computer hardware logic block graphs where
                 randomness in circuit delay is associated with
                 manufacturing variations. The probability distribution
                 of the critical pathlength turns out to be a solution
                 of an unconstrained minimization problem, which can be
                 recast as a convex programming problem with linear
                 constraints. The probability that a given path is
                 critical turns out to be the Lagrange multiplier
                 associated with the constraint determined by the path.
                 The discrete version of the problem can be solved
                 numerically by means of various parametric linear
                 programming formulations, in particular by one which is
                 efficiently solved by Fulkerson's network flow
                 algorithm for project cost curves.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140Z (Other topics in statistics); C1180
                 (Optimisation techniques); C1290F (Systems theory
                 applications in industry)C4190 (Other numerical
                 methods)",
  classification = "723; 922",
  corpsource =   "IBM Data Systems Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit delay; convex programming; cost curves;
                 critical path method; data processing; directed acyclic
                 graph; Fulkerson's network flow algorithm; linear;
                 linear programming; minimisation; PERT; probability;
                 probability distribution; programming; project;
                 unconstrained minimisation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Paivanas:1979:AFS,
  author =       "J. A. Paivanas and J. K. Hassan",
  title =        "Air Film System for Handling Semiconductor Wafers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "361--375",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In an automated fabrication facility, the thin,
                 fragile silicon wafers in which semiconductor circuits
                 are formed must be transported to and from processing
                 stations with a minimum of contact with other solid
                 objects so as to minimize damage, contamination, and
                 consequent lowering of product yield. This task has
                 been undertaken for some time, by systems based on a
                 lubricating film of air as a means for levitating and
                 moving wafers. However, due to inherent motion
                 instabilities and specific control needs, some solid
                 contact is typically involved in effecting prescribed
                 wafer motion. The need for solid contact control is
                 greatly reduced by the air film system described in
                 this paper. It is based on a surface configuration that
                 combines two fluid mechanics phenomena to generate a
                 supporting air film that provides and guides wafer
                 motion. Wafer transportation and positioning are
                 achieved with the air film operating in conjunction
                 with special control device techniques.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B2550
                 (Semiconductor device technology); C3120C (Spatial
                 variables control); C3320 (Control applications to
                 materials handling)",
  classification = "607; 691; 712; 714",
  corpsource =   "IBM Corp., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air film system; automated fabrication facility;
                 control; control device techniques; fluid mechanics;
                 materials handling; materials handling --- Lubrication;
                 pneumatic control equipment; position; positioning;
                 processing stations; semiconductor device manufacture;
                 semiconductor wafers; surface configuration; wafer
                 transportation",
  treatment =    "A Application",
}

@Article{Petersen:1979:MMS,
  author =       "K. E. Petersen",
  title =        "Micromechanical Membrane Switches on Silicon",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "376--385",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new class of electronic devices, micromechanical
                 membrane switches, has been developed. These switches
                 have operating characteristics that fill the gap
                 between conventional silicon transistors and mechanical
                 electromagnetic relays. Although they are batch
                 fabricated on silicon using conventional
                 photolithographic and integrated circuit processing
                 techniques, their unique properties allow them to
                 perform functions not ordinarily associated with
                 silicon. The devices are basically extremely small,
                 electrostatically controlled mechanical relays,
                 typically less than 100 $\mu$ m long. Their high off-to
                 on-state impedance ratio and all-metal conduction paths
                 make them ideally suited for AC signal switching
                 arrays. This paper describes the design, fabrication,
                 operating behavior, and potential applications of these
                 voltage-controlled, micromechanical switches.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2180B (Relays and switches)",
  classification = "712; 714",
  corpsource =   "IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AC signal switching arrays; design; electrostatically
                 controlled mechanical; fabrication; impedance ratio;
                 integrated circuit processing; membranes;
                 micromechanical membrane switches; operating
                 characteristics; photolithographic techniques;
                 photolithography; relays; semiconducting silicon;
                 semiconductor devices; silicon; switches; techniques",
  treatment =    "N New Development",
}

@Article{Lee:1979:ABD,
  author =       "H. C. Lee and J. W. Raider",
  title =        "An application of beam dynamics to a damper design",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "386--391",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Flexural wave propagation may be used as a means of
                 absorbing impact energy to prevent excessive rebound or
                 to shorten the cycle time of high-speed printing
                 devices. For optimal damping action, however, the
                 dynamic analysis of beams used in the mechanism is
                 necessary; this paper presents such an analysis. It
                 also presents an application of damper ring design that
                 is used to prevent so-called ``shadow printing'' by
                 suppressing the rebound of the type elements in a disk
                 printer.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "beam dynamics; computer peripheral equipment; damper
                 ring design; damping; disc printer; dynamic analysis;
                 printers; printing machinery --- Antivibration
                 Mountings; rebound",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Meier:1979:IDP,
  author =       "J. H. Meier and J. W. Raider",
  title =        "Interposer for Disk Printer",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "392--395",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In an impact printer which selects characters by
                 having a hammer hit type elements as they travel at
                 constant velocity past the print location, a
                 significant design problem results from the requirement
                 that the hammer hit only the selected character. In the
                 usual configuration this requirement limits printing
                 speed because the hammer penetrates the plane of the
                 moving type elements and spends a sufficient time in
                 this plane to risk collision with an adjacent type
                 element. This paper describes, for printers with widely
                 separated hammers, a technique to effectively eliminate
                 the ``in-plane'' time. A cammed interposer is used to
                 transfer most of the kinetic energy of the type
                 element, with the remaining energy being absorbed in
                 strain energy of the interposer. For one printer, this
                 technique resulted in an increase in the printing speed
                 from 15 to 30 characters per second.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "745",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cammed interposer; disc printer; hammer; impact
                 (mechanical); impact printer; kinetic energy; printers;
                 printing speed; strain energy; type elements;
                 typewriters",
  treatment =    "A Application; P Practical",
}

@Article{Zable:1979:CPE,
  author =       "J. Zable",
  title =        "Cylindrical Print Element System for a Serial Impact
                 Printer",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "396--402",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "For an impact serial printer, like a typewriter
                 terminal, it is desirable to print fast and to print
                 with a minimum of maintenance. For printing to take
                 place, the carrier containing the print element must be
                 in the correct position along the print line and the
                 character selection must be made by the proper
                 positioning of the print element. This paper discusses
                 a cylindrical thin-walled print element containing an
                 entire character array on its outside surface. The
                 print element is rotated and translated independently
                 by two prime movers (motors). The cylindrical print
                 element geometry and the prime movers are optimized to
                 minimize the time required for character selection.
                 Surface area, stress, inertia, torque, and motor
                 requirements are considered. Selection times and
                 printing rates are computed for simulated printing
                 conditions.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "745",
  corpsource =   "IBM Corp., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "character array; character selection; cylindrical
                 print element system; impact (mechanical); motor
                 requirements; printers; printing rates; serial impact
                 printer; typewriter terminal; typewriters",
  treatment =    "P Practical",
}

@Article{Engel:1979:DRP,
  author =       "P. A. Engel and H. C. Lee and J. L. Zable",
  title =        "Dynamic Response of a Print Belt System",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "403--410",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The dynamic response of a print belt system, when the
                 print belt is subjected to impulsive print forces, is
                 analyzed in this paper. The system consists of a flat
                 steel print belt tightly wrapped around pulleys with
                 one of the pulleys driven by a motor. Analytical
                 modeling allows the prediction and analysis of belt
                 motion and thus the prediction of print
                 misregistration. Discrete parameters used in the
                 analysis permit simulation of the belt motion as
                 affected by variations in belt tension, stiffness,
                 pulley inertias, and motor-operating parameters.
                 Conditions of belt slippage are examined, as well as
                 the effect of dynamic loading upon the drive motor.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "705; 745",
  corpsource =   "IBM Corp., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "belt motion; belt slippage; dynamic loading; dynamic
                 response; electric motors, stepping type; impulsive
                 print forces; motor; print belt system; print
                 misregistration; printers; pulleys; simulation;
                 typewriters",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Helinski:1979:HRS,
  author =       "E. F. Helinski",
  title =        "Harmonic-Drive Ribbon Stuffer for Impact Printers",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "411--414",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a harmonic-motion ribbon-stuffing
                 device for impact printers, which maintains a
                 consistent placement pattern for large-capacity (120
                 yards) endless-loop fabric ribbons. The ribbon is
                 uniformly placed into a cavity by eccentric drive rolls
                 that ensure alternate ribbon switching due to the
                 geometric relationship drive rolls and strippers. The
                 ribbon is positively placed in a manner much like a
                 fixed-displacement drive, thus differing significantly
                 from the principle used by existing ribbon packers,
                 which achieve ribbon placement by balancing the
                 difference in net driving force against the buckling
                 resistance of the ribbon.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C5550 (Printers, plotters and
                 other hard-copy output devices)",
  classification = "745",
  corpsource =   "IBM Corp., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cavity; consistent placement; drives; eccentric drive
                 rolls; harmonic motion; impact (mechanical); impact
                 printers; printers; ribbon stuffer; strippers;
                 typewriters",
  treatment =    "P Practical",
}

@Article{Clark:1979:DSM,
  author =       "William D. Clark",
  title =        "Document Scanner Mechanism",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "415--423",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A document scanner mechanism, developed for use in a
                 conventional copier, having mirrors which scan a
                 document and reflect the image onto a rotating
                 photoconductor drum, is described in this paper. The
                 engineering design and operation of the mechanism are
                 presented, and the development of an analytical model
                 for simulating its operational characteristics is
                 described, together with the results and conclusions of
                 the simulation. A novel means of generating the scan
                 motion and the important design considerations leading
                 to the development of the scanner mechanism are also
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3350L (Control applications in printing and
                 associated industries); C7230 (Publishing and
                 reproduction)",
  classification = "741; 745; 912",
  corpsource =   "IBM Corp., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "business machines; copier; design engineering;
                 document scanner mechanism; engineering design;
                 operational characteristics; photocopying; photographic
                 reproduction; scan motion; simulation",
  treatment =    "P Practical",
}

@Article{Taylor:1979:PES,
  author =       "Russel H. Taylor",
  title =        "Planning and Execution of Straight Line Manipulator
                 Trajectories",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "424--436",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recently developed manipulator control languages
                 typically specify motions as sequences of points
                 through which a tool affixed to the end of the
                 manipulator is to pass. The effectiveness of such
                 motion specification formalisms is greatly increased if
                 the tool moves in a straight line between the
                 user-specified points. This paper describes two methods
                 for achieving such straight line motions. The first
                 method is a refinement of one developed in 1974 by R.
                 Paul. Intermediate points are interpolated along the
                 Cartesian straight line path at regular intervals
                 during the motion, and the manipulator's kinematic
                 equations are solved to produce the corresponding
                 intermediate joint parameter values. The path
                 interpolation functions thus developed offer several
                 advantages, including less computational cost and
                 improved motion characteristics. The second method uses
                 a motion planning phase to precompute enough
                 intermediate points so that the manipulator may be
                 driven by interpolation of joint parameter values while
                 keeping the tool on an approximately straight line
                 path. This technique allows a substantial reduction in
                 real time computation and permits problems arising from
                 degenerate joint alignments to be handled more easily.
                 The planning is done by an efficient recursive
                 algorithm which generates only enough intermediate
                 points to guarantee that the tool's deviation from a
                 straight line path stays within prespecified error
                 bounds.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3320 (Control applications to materials handling);
                 C7420 (Control engineering computing)",
  classification = "731",
  corpsource =   "IBM Corp., Boca Raton, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Cartesian straight line path; computerised materials
                 handling; control, mechanical variables; equations;
                 intermediate points; interpolation; interpolation of
                 joint parameter values; kinematic; languages;
                 management; manipulator control; motion planning;
                 recursive algorithm; straight line manipulator
                 trajectories; systems science and cybernetics ---
                 Artificial Intelligence",
  treatment =    "A Application",
}

@Article{Bogy:1979:NES,
  author =       "D. B. Bogy and J. E. Fromm and F. E. Talke",
  title =        "Numerical and Experimental Study of the
                 Bistable-Unstable Transition in Pressurized Flexible
                 Disk Files",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "437--449",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The bistable operating region of flexible disk files
                 is limited at decreasing air flow rates by a transition
                 at which undesirable gaps appear in the otherwise
                 uniformly spaced disks of the pack. These spontaneous
                 gaps, as opposed to the externally controlled gaps of
                 the bistable range, are a consequence of local air flow
                 fields at the outer edge of the disks. Experiments with
                 external shrouds of various clearance showed axial
                 periodicity in the occurrence of the gaps and provided
                 physical insight which led to quantitative numerical
                 solution of the nonlinear fluid equations. Two scales
                 of the flow, i.e., the flow between individual disks
                 and a peripheral unstable Couette flow, are found to
                 couple in such a manner as to delineate the
                 transition.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290K (Nonlinear and functional equations); B3120B
                 (Magnetic recording); C1320 (Stability in control
                 theory); C4150 (Nonlinear and functional equations);
                 C5320C (Storage on moving magnetic media); C5320
                 (Digital storage)",
  classification = "912",
  corpsource =   "Univ. of California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "axial periodicity; bistable/unstable transition;
                 business machines; Couette flow; equations; external
                 shrouds; files; local air flow fields; magnetic disc
                 and drum storage; nonlinear; nonlinear fluid; numerical
                 solution; peripheral unstable Couette flow; pressurised
                 flexible disc; spontaneous gaps; stability",
  treatment =    "A Application; X Experimental",
}

@Article{Bogy:1979:EDC,
  author =       "D. B. Bogy and N. Bugdayci and F. E. Talke",
  title =        "Experimental Determination of Creep Functions for Thin
                 Orthotropic Polymer Films",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "450--458",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Stringent requirements on the dimensional stability of
                 polymer films used as substrates for magnetic recording
                 make it necessary to experimentally determine their
                 anisotropic viscoelastic behavior. This paper deals
                 with the measurement of the time-dependent,
                 longitudinal elongation and lateral contraction of 50
                 multiplied by 900-mm biaxially longitudinal elongation,
                 and a laser-scanning technique is used for measuring
                 lateral contraction. Preliminary investigations are
                 carried out to determine the static Poisson's ratio, to
                 check the linearity of longitudinal creep with respect
                 to load, and to investigate the validity of the
                 time-temperature superposition hypothesis. In addition,
                 tests are described in which longitudinal and lateral
                 creep of the specimens are simultaneously measured
                 under constant loads in temperature-and
                 humidity-controlled environments. It is found that the
                 Poisson's ratio has only a weak dependence on time,
                 and, therefore, a good approximation may be obtained by
                 treating the Poisson's ratio as independent of time.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0560 (Polymers and plastics (engineering materials
                 science))B0590 (Materials testing); B3120B (Magnetic
                 recording); B7320Z (Other nonelectric variables
                 measurement)",
  classification = "815; 817",
  corpsource =   "Univ. of California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "by laser beam; creep functions; creep testing;
                 elongation; lateral contraction; longitudinal
                 elongation; magnetic recording; measurement;
                 orthotropic polyethylene terephthalate; plastic films
                 --- Stability; Poisson ratio; polymer films; polymers;
                 strips",
  treatment =    "X Experimental",
}

@Article{Marinace:1979:TSE,
  author =       "J. C. Marinace",
  title =        "Tunnels in semiconductor epitaxy",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "4",
  pages =        "459--461",
  month =        jul,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 B0510D (Epitaxial growth)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "grooves; growth; phase epitaxial growth; semiconductor
                 epitaxial layers; semiconductor epitaxy; semiconductor
                 growth; tunnels; vapour",
  treatment =    "P Practical",
}

@Article{Sorokin:1979:CIL,
  author =       "P. P. Sorokin",
  title =        "Contributions of {IBM} to laser science-1960 to the
                 present",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "476--489",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4260 (Laser systems and laser beam applications);
                 B4320 (Lasers)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "laser applications; laser science; lasers; reviews",
  treatment =    "G General Review",
}

@Article{Wynne:1979:SBA,
  author =       "J. J. Wynne and J. A. Armstrong",
  title =        "Systematic Behavior in Alkaline Earth Spectra: a
                 Multichannel Quantum Defect Analysis",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "490--503",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "``Two-electron'' atoms are more complex than
                 ``one-electron'' atoms because of electron-electron
                 interactions. This leads to spectra that are not well
                 understood. Using multiple photon excitation and
                 ionization detection, the authors have extensively
                 studied Rydberg series of states in Ca, Sr, and Ba. The
                 spectroscopic data were interpreted by using
                 multichannel quantum defect theory (MQDT). In this
                 context, systematic trends in the atom series Ca, Sr,
                 and Ba are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3220 (Atomic spectra grouped by wavelength ranges);
                 A3280K (Multiphoton processes in atoms)",
  classification = "549; 801",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alkaline earth metals; atomic; atomic spectra; Ba;
                 barium; Ca; calcium; excitation; ionization detection;
                 laser spectroscopy; many electron atoms; multichannel
                 quantum defect analysis; multiphoton spectra; multiple
                 photon; Rydberg series; spectra; Sr; strontium",
  treatment =    "X Experimental",
}

@Article{Loy:1979:TCT,
  author =       "M. M. T. Loy",
  title =        "Two-Photon Coherent Transients",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "504--516",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Two-photon mutation, free-induction decay, and
                 population inversion by adiabatic rapid passage have
                 been studied in NH$_3$. These effects are easily
                 visualized with a vector model. Relaxation times T$_1$
                 and T$_2$ have been measured.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4265G (Optical transient phenomena, self-induced
                 transparency, optical saturation and related effects)",
  classification = "931; 952",
  corpsource =   "IBM Thomas J. Watson, Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adiabatic rapid passage; ammonia; buffer gas; free
                 induction decay; nutation; optical coherent; optical
                 coherent transients; photons; population inversion;
                 population relaxation time; quantum theory; transients;
                 two photon phase relaxation time; two photon vector
                 model",
  treatment =    "X Experimental",
}

@Article{Morawitz:1979:CEE,
  author =       "H. Morawitz",
  title =        "Cooperative Emission of an Excited Monolayer into
                 Surface Plasmons",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "517--526",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The cooperative emission of an excited molecular
                 monolayer into surface plasmons of a metallic substrate
                 is described. The effect arises from the very strong
                 coupling of an electronically excited molecule to
                 surface plasmons at distances that are short compared
                 to the wavelength of the electronic transition. Strong
                 resonant enhancement of this excited molecule-surface
                 plasmon interaction occurs for near-degeneracy of the
                 electronic transition frequency and the asymptotic
                 surface plasmon frequency $\omega_p/2^{1/2}$. It is
                 shown theoretically how the two-dimensional analogue of
                 superradiance can arise, leading to a highly
                 directional and very intense surface plasmon pulse.
                 This pulse or series of pulses has soliton-like
                 characteristics and may be expected to propagate for
                 considerably longer distances along the metal-vacuum
                 interface than do individual surface plasmons.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7145G (Exchange, correlation, dielectric and magnetic
                 functions, plasmons); A7320 (Electronic surface
                 states); A7845 (Stimulated emission (condensed
                 matter))",
  classification = "741; 744",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "asymptotic surface plasmon; cooperative emission;
                 electron states; electronic transition; excited
                 molecular monolayer; frequency; lasers --- Theory;
                 light; metal dielectric interface; plasmons; polariton
                 modes; stimulated emission; superradiance; surface;
                 surface electron states",
  treatment =    "T Theoretical or Mathematical",
}

@Article{DeVoe:1979:SOF,
  author =       "R. G. DeVoe and R. G. Brewer",
  title =        "Subnanosecond Optical Free-Induction Decay",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "527--533",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A novel form of laser frequency switching is devised
                 that extends coherent optical transient studies to a
                 100-picosecond time scale, the measurements being
                 performed in real time. Free-induction decay (FID) on a
                 subnanosecond time scale reveals new features, such as
                 a first-order FID that dephases with the inhomogeneous
                 dephasing time T*$_2$ and interferes with the
                 well-known nonlinear FID. A complete analytical
                 expression for optical FID is derived and supports the
                 FID observations for the sodium D$_1$ transition.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4265G (Optical transient phenomena, self-induced
                 transparency, optical saturation and related effects)",
  classification = "744; 941",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "detection; electrooptic phase modulator; free
                 induction decay; heterodyne; inhomogeneous dephasing
                 time; laser frequency switching; lasers; Na; optical
                 coherent transients; optical variables measurement;
                 subnanosecond time scale; travelling wave",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Burland:1979:OTL,
  author =       "D. M. Burland and D. Haarer",
  title =        "One-And Two-Photon Laser Photochemistry in Organic
                 Solids",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "534--546",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The criteria for site-selective low-temperature laser
                 photochemistry in organic solids are discussed within a
                 general framework that includes both one-and two-photon
                 photochemical reaction schemes. Requirements are
                 identified for the use of this photochemistry in
                 photochemical hole burning applications such as
                 high-resolution spectroscopy and the study of
                 low-temperature reaction mechanisms. The one-and
                 two-photon reaction schemes are quite different from
                 one another with respect to excited state geometries nd
                 short-lived photoreactive intermediates. The reversible
                 tautomerism of quinizarin in hydrogen-bonded host
                 materials is studied as a one-photon example. The
                 photochemistry involves both intra-and intermolecular
                 hydrogen bonds. The photodissociations of s-tetrazine
                 (ST) and dimethyl-s-tetrazine (DMST) are studied as
                 examples of the two-photon reaction and a kinetic
                 scheme is proposed for the tetrazine case. The
                 intensity dependence of the photochemistry in solids is
                 modeled mathematically.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8250 (Photochemistry and radiation chemistry)",
  classification = "741; 802; 804",
  corpsource =   "IBM Res. Div Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chemical reactions --- Photochemical Reactions;
                 dimethyl s-tetrazine; excited state; geometries;
                 H-bonded host materials; high; intensity dependence;
                 isomerisation; low temperature reaction; mechanisms;
                 molecular photodissociation; organic compounds; organic
                 solids; photochemical hole burning; photochemistry;
                 photodissociations; photoreactive intermediates;
                 quinizarin; resolution spectroscopy; reversible;
                 s-tetrazine; tautomerism; two photon laser
                 photochemistry",
  treatment =    "X Experimental",
}

@Article{Volker:1979:PHB,
  author =       "S. V{\"o}lker and R. M. Macfarlane",
  title =        "Photochemical Hole Burning in Free-Base Porphyrin and
                 Chlorin in {N}-Alkane Matrices",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "547--555",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In inhomogeneously broadened lines, selective
                 photochemistry with narrow band lasers leads to
                 photochemical hole burning. This phenomenon is
                 described with particular reference to free-base
                 porphyrin (H$_2$P) and chlorin molecules in n-alkane
                 matrices at low temperatures. It is shown that hole
                 burning, which is permanent at low temperatures, can be
                 used to study homogeneous optical dephasing processes
                 as a function of temperature, to measure fast vibronic
                 relaxation, and to assign complex vibronic spectra.
                 Some of the parameters that are important to the
                 potential use of photochemical hole burning for
                 information storage in inhomogeneously broadened lines
                 are measured and discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8250 (Photochemistry and radiation chemistry)",
  classification = "741; 744; 801; 802",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "burning; chemical reactions; complex vibronic; fast
                 vibronic relaxation; free base chlorin; free base
                 porphyrin; homogeneous optical dephasing; information
                 storage; inhomogeneously broadened lines; n-alkane
                 matrices; narrow band lasers; photochemical hole;
                 photochemistry; processes; spectra; spectroscopy",
  treatment =    "X Experimental",
}

@Article{Bethune:1979:TIS,
  author =       "D. S. Bethune and J. R. Lankard and M. M. T. Loy and
                 P. P. Sorokin",
  title =        "Time-Resolved Infrared Spectral Photography: a New
                 Technique",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "556--575",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new technique for photographic or multichannel
                 photoelectric recording of broad band infrared
                 absorption spectra with approximately 5-ns time
                 resolution is described. The technique is based on
                 resonant four-wave mixing in alkali metal vapors.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765G (IR spectroscopy and spectrometers); A0768
                 (Photography, photographic instruments and
                 techniques)",
  classification = "801; 932",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alkali metal vapours; broad band infrared absorption
                 spectra; four wave mixing; infrared spectral
                 photography; multichannel photoelectric; photographic
                 applications; recording; resolved spectroscopy;
                 resonant; spectroscopy, absorption; spectroscopy,
                 infrared; time; time resolved spectroscopy",
  treatment =    "A Application; N New Development",
}

@Article{Crow:1979:GLR,
  author =       "J. D. Crow",
  title =        "{(GaAl)As} Laser Requirements for Local Attached Data
                 Link Applications",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "576--584",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The characteristics of (GaAl)As double heterostructure
                 stripe contact injection lasers as they relate to
                 applications in fiber optic data transmission systems
                 are reviewed. The laser characteristics are treated as
                 optical, electrical, thermal, and mechanical interfaces
                 to the system in order to emphasize the necessity of
                 designing devices as a functional part of a system or
                 subsystem. It is concluded that the laser is generally
                 well suited as an optical source in a card-mountable
                 hybrid module transmitter for data links up to a few km
                 and approximately equals 100 Mbit/s data rates. Areas
                 requiring further development include lowering of the
                 laser threshold current, improving the modal stability,
                 packaging the laser with electronics and fiber optic
                 transmission lines, and improving the laser lifetime
                 under varying ambient temperature conditions.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255P (Lasing action in semiconductors); A4260B
                 (Design of specific laser systems); A4280S (Optical
                 communications devices); B4320J (Semiconductor lasers);
                 B6260 (Optical links and equipment)",
  classification = "717; 744",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(GaAl)As; aluminium compounds; ambient; double
                 heterostructure; fibre optic data transmission; gallium
                 arsenide; hybrid module transmitter; III-V
                 semiconductors; laser; laser lifetime; lasers; lasers,
                 solid state; local attached data link; model stability;
                 optical communication equipment; optical source;
                 semiconductor function lasers; semiconductor junction;
                 stripe contact injection; telecommunication links,
                 optical; temperature conditions; threshold current",
  treatment =    "A Application; P Practical",
}

@Article{Lynch:1979:GLT,
  author =       "R. T. {Lynch, Jr.} and M. B. Small and R. Y. Hung",
  title =        "{GaAs\slash (GaAl)As} Laser Technology",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "585--595",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is a review of some recent work at IBM on
                 semiconductor injection lasers. An automated system has
                 been built and used for the epitaxial growth of laser
                 material, and the paper describes testing procedures
                 used to characterize this material. Results on the
                 degradation of these lasers at high continuous wave
                 optical power are also presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4255P (Lasing action in semiconductors); A8110D
                 (Crystal growth from solution); A8115L (Deposition from
                 liquid phases (melts and solutions)); B0510D (Epitaxial
                 growth); B4320J (Semiconductor lasers)",
  classification = "744; 932",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aluminium compounds; continuous wave optical power;
                 crystals --- Epitaxial Growth; degradation;
                 GaAs-(GaAl)As; gallium arsenide; III-V semiconductors;
                 injection; junction lasers; lasers; lasers, solid
                 state; liquid phase epitaxial growth; reliability;
                 semiconductor; semiconductor junction lasers",
  treatment =    "G General Review",
}

@Article{Luntz:1979:MBL,
  author =       "A. C. Luntz",
  title =        "Molecular Beam Laser-Induced Fluorescence Studies of
                 Chemical Reactions",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "596--603",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Crossed molecular beam experiments that use
                 laser-induced fluorescence spectroscopy as the detector
                 allow measurements of the internal state distribution
                 in the products of chemical reactions studied under
                 well-controlled single-collision conditions. This
                 technique provides direct information on the chemical
                 dynamics and the intermolecular potential
                 surfaces. Application to the reactions H plus NO$_2$
                 yields OH plus NO and O(**3P) plus C$_6$H$_{12}$ yields
                 OH plus C$_6$H$_{11}$ is discussed where the OH state
                 distribution has been measured.",
  acknowledgement = ack-nhfb,
  classification = "741; 744; 802; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chemical reactions; fluorescence --- Laser
                 Applications; molecular beams --- Applications",
}

@Article{Pohl:1979:FRS,
  author =       "D. W. Pohl",
  title =        "Forced {Rayleigh} Scattering",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "5",
  pages =        "604--614",
  month =        sep,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Forced Rayleigh scattering (FRS) is a light scattering
                 technique used to investigate light-induced grating
                 structures that decay in a relaxational or almost
                 relaxational manner. Such gratings can be created by
                 interference and absorption of two pump beams and
                 probed by a third beam, usually of different frequency.
                 They may consist of spatially varying excited state
                 populations with picosecond lifetimes or of long-lived
                 variations in temperature, composition, and\slash or
                 density. Forced Rayleigh scattering provides high
                 sensitivity with respect to the amplitude and dynamics
                 of such gratings and allows investigations not
                 accessible by classical scattering techniques. The
                 principles, techniques, and applications of FRS are
                 reviewed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7835 (Brillouin and Rayleigh scattering (condensed
                 matter))",
  classification = "741; 744",
  corpsource =   "IBM Zurich Res. Div. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "absorption; excited state populations; forced Rayleigh
                 scattering; interference; lasers --- Theory; light;
                 light induced grating structures; pump beams; Rayleigh
                 scattering; relaxational decay; reviews; spatially
                 varying",
  treatment =    "G General Review",
}

@Article{Ruehli:1979:SCE,
  author =       "Albert E. Ruehli",
  title =        "Survey of Computer-Aided Electrical Analysis of
                 Integrated Circuit Interconnections",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "626--639",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In the last decade an important shift has taken place
                 in the design of hardware with the advent of smaller
                 and denser integrated circuits and packages. Analysis
                 techniques are required to ensure the proper electrical
                 functioning of this hardware. This paper gives a
                 coherent survey of the modeling and computer-aided
                 design techniques applicable to solving these problems.
                 Methods are considered for the computation of
                 resistances, capacitances, and inductances.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); C7410D
                 (Electronic engineering computing)",
  classification = "703; 713; 714; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; circuit analysis computing; circuit CAD;
                 circuit layout CAD; computer aided circuit; electric
                 networks, active --- Computer Aided Analysis;
                 equivalent circuits; integrated circuit
                 interconnections; integrated circuits; large scale
                 integration",
  treatment =    "B Bibliography; G General Review; T Theoretical or
                 Mathematical",
}

@Article{Sakkas:1979:PDM,
  author =       "Constantine M. Sakkas",
  title =        "Potential Distribution and Multi-Terminal {DC}
                 Resistance Computations for {LSI} Technology",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "640--651",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "418.65064",
  abstract =     "Computer time and storage requirements are the two
                 main considerations in the design of a packaging
                 analysis software tool for the problem of calculating
                 the electric potential distribution in arbitrary
                 geometrical shapes. The FEM (Finite Element Method) is
                 the accepted approach for solving such problems. A new
                 formulation for the linear triangular element is
                 presented which is used to derive a very simple and
                 computationally inexpensive linear rectangular element
                 equation interrelating only the geometrical centers of
                 the elements. The result is a much sparser assembly
                 matrix with a maximum of five non-zero entries per
                 equation compared with the usual nine of the
                 formulation. In addition, a method to obtain the
                 minimum bandwidth of the matrix is given for the
                 efficient and static use of external storage,
                 permitting the solution of any size problem. The
                 methods are applicable to multi-plane, multi-terminal
                 configurations for the production of
                 equivalent-resistance networks and for the calculation
                 of the potential distribution throughout the
                 configurations.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290F (Interpolation and function approximation);
                 B1130B (Computer-aided circuit analysis and design);
                 B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); C4130 (Interpolation and function
                 approximation); C7410D (Electronic engineering
                 computing)",
  classification = "713; 714; 715; 921",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; circuit analysis computing; circuit CAD;
                 computer aided circuit analysis; computer storage
                 requirements; computer time requirements; electric
                 potential distribution; electronics packaging; finite
                 element; finite element method; integrated circuits ---
                 Large Scale Integration; large scale integration;
                 linear triangular element; mathematical techniques ---
                 Finite Element Method; multiterminal DC resistance;
                 packaging analysis software tool; resistance
                 computations",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Weeks:1979:RIS,
  author =       "William T. Weeks and Leon Li-Heng Wu and Michael F.
                 McAllister and Ajit Singh",
  title =        "Resistive and Inductive Skin Effect in Rectangular
                 Conductors",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "652--660",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model based on network theory is presented for
                 calculating the frequency-dependent resistance and
                 inductance per unit length matrices for transmission
                 line systems consisting of conductors with rectangular
                 cross sections. The calculated results are compared
                 with actual measurements. Excellent agreement is
                 obtained over a wide range of frequencies, including
                 the mid-range where neither DC values nor
                 high-frequency limit values apply.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2110 (Conductors); B2120 (Resistors); B2140
                 (Inductors and transformers); B2160 (Wires and cables);
                 B5240 (Transmission line theory)",
  classification = "704; 706; 714",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided circuit analyses; conductors
                 (electric); effect; electric conductors; electric lines
                 --- Mathematical Models; electric resistance;
                 frequencies; frequency dependent; frequency dependent
                 resistance; inductance; interchip wiring; midrange;
                 rectangular conductors; skin; skin effect; systems;
                 transmission line; transmission line theory; wiring",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Brennan:1979:TIC,
  author =       "Pierce A. Brennan and Norman Raver and Albert E.
                 Ruehli",
  title =        "Three-Dimensional Inductance Computations with Partial
                 Element Equivalent Circuits",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "661--668",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Inductance computations represent an important part in
                 the design of hardware packages, especially for high
                 performance computers. Partial element equivalent
                 circuits (PEEC) are used in this paper to investigate
                 two problems, viz., the inductance of ground plane
                 connections and the reduction in inductance due to eddy
                 currents set up in perpendicular crossing wires. The
                 results from the PEEC models are compared, for the
                 first problem, to experimental hardware measurements
                 and, in the second case, to simplified analytical
                 solutions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2140 (Inductors and transformers); B2160D (Cable
                 accessories); C7410D (Electronic engineering
                 computing)",
  classification = "722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytical solutions; circuit analysis computing;
                 computations; computer hardware package design;
                 computers; computers, analog --- Circuits; computers,
                 digital; digital integrated circuits; eddy current;
                 effects; equivalent circuits; ground plane connections;
                 high performance; inductance; partial element
                 equivalent circuits; perpendicular crossing; three
                 dimensional inductance; wires",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Weeks:1979:ESE,
  author =       "William T. Weeks",
  title =        "Exploiting Symmetry in Electrical Packaging Analysis",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "669--674",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "433.15004",
  abstract =     "Many properties of physical systems can be expressed
                 by symmetric matrices of order n, where n is the number
                 of components in the system. The computer storage
                 requirement for inverting the most general symmetric
                 matrix is n(n plus 1)/2 storage locations. For large
                 values of n, the number of multiplications required is
                 proportional to n**3. If the physical system possesses
                 certain geometrical symmetries, both the amount of
                 storage and the number of multiplications can be
                 reduced substantially. It is shown that if the physical
                 system possesses p orthogonal planes of symmetry, where
                 p equals 1, 2, or 3, and if n is sufficiently larger,
                 then the storage requirement can be reduced
                 approximately by 1/2**p and the number of
                 multiplications by 1/4**p.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B0210 (Algebra); B1130B
                 (Computer-aided circuit analysis and design); C1110
                 (Algebra)C7410D (Electronic engineering computing)",
  classification = "715; 921",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit analysis computing; computer; electrical
                 packaging analysis; electronics packaging; inversion;
                 mathematical techniques --- Matrice Algebra; matrix;
                 matrix algebra; physical symmetry exploitation; storage
                 requirements; symmetric matrices",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gruodis:1979:TAU,
  author =       "Algirdas J. Gruodis",
  title =        "Transient Analysis of Uniform Resistive Transmission
                 Lines in a Homogeneous Medium",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "675--681",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Transient analysis of resistive transmission lines has
                 always been difficult. The need for this type of
                 analysis, however, did not become critical until
                 high-density circuit packaging became commonplace. This
                 paper discusses a method for the transient analysis of
                 resistive lines. It does not require a large number of
                 equivalent circuit elements, and yet it can be used to
                 represent a resistive line to any desired accuracy.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B5240 (Transmission line theory); C7410D (Electronic
                 engineering computing)",
  classification = "703; 715",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit analysis computing; electric networks;
                 electrical; electronics packaging; homogeneous medium;
                 interchip wiring; large scale integration; LSI chips
                 packaging; packaging analysis; transient analysis;
                 transient response; transmission line theory; uniform
                 resistive transmission lines; wiring",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gaensslen:1979:GES,
  author =       "Fritz H. Gaensslen",
  title =        "Geometry Effects of Small {MOSFET} Devices",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "682--688",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The effects of diminishing MOS inversion channel
                 length or width on device characteristics are
                 discussed. As opposed to the geometric device size, an
                 ``electric device size'' is established by normalizing
                 all dimensions on an appropriately chosen depletion
                 layer width. It is shown how this ``electric size''
                 governs the intensity of geometry effects. DC device
                 modeling methods are reviewed with respect to their
                 ease of application to electrically small devices.
                 Finally, means for reduction of geometry effects are
                 considered.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560R (Insulated gate field effect
                 transistors); B2570F (Other MOS integrated circuits)",
  classification = "714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "channel effects; DC modelling; device characteristics;
                 device size; electric device size; geometric; geometry
                 effects; insulated gate field effect transistors;
                 integration; large scale; narrow channel effects;
                 semiconductor device models; semiconductor devices,
                 mis; short; small MOSFET devices; transistors, field
                 effect",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Gillespie:1979:SLP,
  author =       "Sherry J. Gillespie",
  title =        "Stability of Lateral pnp Transistors During
                 Accelerated Aging",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "689--695",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Lateral pnp devices stressed under accelerated
                 temperature and voltage conditions show a degradation
                 in the transistor breakdown voltage. These results and
                 additional experiments that were conducted to better
                 understand the mechanisms involved in the observed
                 behavior are described. It was concluded that the
                 degradation can be related to a negative surface charge
                 in the base region of the transistor. This preliminary
                 finding has design and process implications for
                 potential improvement of bipolar device reliability in
                 applications that call for high voltages and low
                 epitaxial doping concentration.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B2560J (Bipolar transistors)",
  classification = "714",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accelerated ageing; accelerated temperature and
                 voltage; ageing; base region; bipolar transistors;
                 breakdown voltage degradation high voltage devices;
                 charge; conditions; degradation; epitaxial doping
                 concentration; lateral pnp transistors; low; mechanism;
                 negative surface; process implications; reliability;
                 semiconductor devices --- Stability; stability; states;
                 surface; surface electron; transistor breakdown
                 voltage; transistors",
  treatment =    "X Experimental",
}

@Article{Coppersmith:1979:EPN,
  author =       "Don Coppersmith and D. T. Lee and Chak Kuen Wong",
  title =        "An Elementary Proof of Nonexistence of Isometries
                 Between $l_p^k$ and $l_q^k$",
  journal =      j-IBM-JRD,
  volume =       "23",
  number =       "6",
  pages =        "696--699",
  month =        nov,
  year =         "1979",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68C25 (46A45 46C10)",
  MRnumber =     "80i:68030",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "424.68026",
  abstract =     "For k equals 2, the two-dimensional coordinate spaces
                 $l_1^2$ and $l\infty^2$ are isometric. Consequently,
                 results on computational complexity for one space can
                 be transplanted to the other in a natural way. In this
                 note, an elementary proof is given for the nonisometry
                 between $l_p^k$ and $l_q^k$ for general $k$, $p$, and
                 $q$.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory)",
  classification = "921",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computational complexity; coordinate spaces;
                 elementary proof; mathematical techniques;
                 multidimensional; nonisometry between spaces",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Schmookler:1980:DLA,
  author =       "Martin S. Schmookler",
  title =        "Design of Large {ALUs} Using Multiple {PLA} Macros",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "2--14",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes methods of designing large
                 Arithmetic and Logical Units (ALUs) using multiple
                 Programmable Logic Array (PLA) macros in which the
                 outputs are obtained in one cycle corresponding to one
                 pass through any PLA. The design is based on the
                 well-known technique of providing conditional sums and
                 group carries in parallel and selecting the proper sum
                 using gating circuits. Several techniques are described
                 for optimizing one-pass PLA adders and for extending
                 previously published techniques to larger-width
                 adders.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5120 (Logic and switching
                 circuits); C5210 (Logic design methods)",
  classification = "721; 723",
  corpsource =   "IBM General Systems Div. Lab., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "ALUs; Boolean; carry look ahead; computers --- Adders;
                 design method; EXOR circuits; integrated logic
                 circuits; large arithmetic and logic units; logic
                 design; multiple PLA macros; multiple programmable
                 logic array; operations; providing conditional; sum
                 using gating circuits; sums and group carries;
                 Weinberger adder",
  treatment =    "P Practical",
}

@Article{Eichelberger:1980:HTG,
  author =       "E. B. Eichelberger and E. Lindbloom",
  title =        "Heuristic Test-Pattern Generator for Programmable
                 Logic Arrays",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "15--22",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a heuristic method for generating
                 test patterns for Programmable Logic Arrays (PLAs).
                 Exploiting the regular structure of PLAs, both random
                 and deterministic test-pattern generation techniques
                 are combined to achieve coverage of crosre n is the
                 number of components in the system. The computer
                 storage requirement for inverting the most general
                 symmetric matrix is n(n plus 1)/2 storage locations.
                 For large values of n, the number of multiplications
                 required is proportional to n**3. If the physical
                 system possesses certain geometrical symmetries, both
                 the amount of storage and the number of multiplications
                 can be reduced substantially. It is shown that if the
                 physical system possesses p orthogonal planes of
                 symmetry, where p equals 1, 2, or 3, and if n is
                 sufficiently larger, then the storage requirement can
                 be reduced approximately by 1/2**p and the number of
                 multiplications by 1/4**p.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B1230G
                 (Function generators); B1265B (Logic circuits); B2570
                 (Semiconductor integrated circuits); C5120 (Logic and
                 switching circuits)",
  classification = "715; 721; 723; 921",
  corpsource =   "IBM System Communications Div. Lab., Kingston, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computationally; cross point defects coverage;
                 electronics packaging; exploiting PLA regular;
                 generating test patterns; heuristic test pattern
                 generator; inexpensive; integrated circuit testing;
                 integrated logic circuits; logic; logic circuits; logic
                 design; mathematical techniques --- Matrice Algebra;
                 paths; PL/I program implementation; PLA testing;
                 programmable logic arrays; structure; test; testing",
  treatment =    "G General Review; P Practical",
}

@Article{Golden:1980:DAP,
  author =       "R. L. Golden and P. A. Latus and P. Lowy",
  title =        "Design Automation and the Programmable Logic Array
                 Macro",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "23--31",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper describes a chip design methodology which is
                 based on the use of PLA structures (or macros) within a
                 chip. Logic functions in array form are specified in a
                 compact notation that is automatically converted either
                 to array personalization patterns or to conventional
                 logic blocks for input to existing checking and testing
                 software. Simulation of any logic array is performed by
                 a single program subroutine operating on these
                 patterns.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210B (Computer-aided logic
                 design); C7410D (Electronic engineering computing)",
  classification = "721; 723",
  corpsource =   "IBM System Communications Div. Lab., Kingston, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit layout CAD; computers, microprocessor ---
                 Design; design automation; integrated logic circuits;
                 logic CAD; logic design; PLA; programmable logic array
                 macro; simplifies LSI chip design",
  treatment =    "G General Review",
}

@Article{Patel:1980:ERS,
  author =       "Arvind M. Patel",
  title =        "Error Recovery Scheme for the {IBM 3850 Mass Storage
                 System}",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "32--42",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper presents a comprehensive scheme for error
                 recovery for the 3850 MSS which features a new
                 error-correction code in a serial, single-stripe data
                 format. The recovery procedure is designed around
                 resynchronizable sections of data which are rendered
                 independent of each other in error modes through the
                 use of zero-modulation encoding and self-contained
                 error-detection pointers. These error-detection
                 pointers and the resynchronization signals are utilized
                 in conjunction with interleaved codewords of the
                 error-correction code.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C5560 (Data
                 preparation equipment)",
  classification = "723",
  corpsource =   "IBM General Products Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "code structure; codes, symbolic --- Error Correction;
                 data storage, digital; detection pointers; economical;
                 error correction code; error correction codes; error
                 recovery; IBM 3850 mass storage system; implementation;
                 interleaved codewords; magnetic tape recording;
                 magnetic tape storage; resynchronization signals;
                 scheme; self contained error",
  treatment =    "G General Review; N New Development",
}

@Article{Franaszek:1980:SBD,
  author =       "P. A. Franaszek",
  title =        "Synchronous Bounded Delay Coding for Input Restricted
                 Channels",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "43--48",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A24",
  MRnumber =     "81a:94025",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper treats the problem of constructing fixed
                 rate (synchronous) codes for the input restricted
                 channels subject to a constraint that the coding delay
                 be bounded by a parameter M. M is the maximum number of
                 information symbols required by the coder in choosing a
                 word during transmission.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  classification = "731",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "construction; encoding; finite state machines
                 modelling; information theory; input restricted
                 channels; synchronous bounded delay coding; synchronous
                 codes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ahuja:1980:DDE,
  author =       "Vijay Ahuja",
  title =        "Determining Deadlock Exposure for a Class of Store and
                 Forward Communication Networks",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "49--55",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68A05 (68E10)",
  MRnumber =     "80i:68003",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of the deadlock for message buffers is
                 considered for store and forward communication networks
                 that have fixed routes for message transmission between
                 any two nodes. It is shown that a routed network is
                 exposed to deadlock if and only if there exists a
                 complete weighted matching of an appropriately defined
                 bipartite graph for some subgraph of the network graph.
                 An approach for determining whether a deadlock can
                 occur is presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); B6120B (Codes);
                 B6210L (Computer communications); C1160 (Combinatorial
                 mathematics); C5600 (Data communication equipment and
                 techniques)",
  classification = "723",
  corpsource =   "IBM System Communications Div. Lab., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "complete weighted matching; computer networks;
                 deadlock exposure; determination; graph theory; network
                 graph; packet switching; pocket switching; routed
                 networks; store and forward communication networks",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lin:1980:COS,
  author =       "Shu Lin and George Markowsky",
  title =        "On a Class of One-Step Majority-Logic Decodable Cyclic
                 Codes",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "56--63",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94B15",
  MRnumber =     "80i:94015",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A class of one-step majority-logic decodable codes is
                 investigated. A method of decoding these codes has been
                 presented. Combinatorial expressions for determining
                 the dimensions of these codes have been derived. These
                 codes are effective compared with other majority-logic
                 decodable codes.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B6120B (Codes)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "codes, symbolic; decodable codes; decoding; error
                 correction codes; high speed digital data transmission
                 systems; majority logic; majority logic decodable
                 cyclic codes; one step",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wesley:1980:GMS,
  author =       "M. A. Wesley and T. Lozano-Perez and L. I. Lieberman
                 and M. A. Lavin and D. D. Grossman",
  title =        "Geometric Modeling System for Automated Mechanical
                 Assembly",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "64--74",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper describes a computer-based system for
                 modeling three-dimensional (3-D) objects. The system
                 generates a data base in which objects and assemblies
                 are represented by nodes in a graph structure. The
                 edges of the graph represent relationships among
                 objects such as part-of, attachment, constraint, and
                 assembly. The nodes also store positional relationships
                 between objects and physical properties such as
                 material type. The user designs objects by combining
                 positive and negative parameterized primitive volumes,
                 for example, cubes and cones, which are represented
                 internally as polyhedra.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7440 (Civil and mechanical engineering computing)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "assembling; automated mechanical assembly; computer
                 simulation; digital simulation; geometric modelling
                 system; high level programming languages; material
                 type; mechanical assemblies; modelling; parameterized
                 primitive volumes; positional relationships; three
                 dimensional objects; very",
  treatment =    "G General Review",
  xxauthor =     "M. A. Wesley and L. I. Lieberman and M. A. Lavin and
                 D. D. Grossman and T. Lozano-Perez",
}

@Article{Chung:1980:CPR,
  author =       "K. M. Chung and F. Luccio and C. K. Wong",
  title =        "On the Complexity of Permuting Records in Magnetic
                 Bubble Memory Systems",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "75--84",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of permuting records in various simple
                 models of magnetic bubble memories is studied. Several
                 simple models are proposed with numbers of switches
                 ranging between 1 and n and respective time
                 complexities and respective numbers of control states
                 are analyzed for some permutation algorithms.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120L (Magnetic bubble domain devices); C5320E
                 (Storage on stationary magnetic media); C6120 (File
                 organisation)",
  classification = "721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "complexities; control states; data storage, magnetic;
                 file organisation; magnetic bubble devices; magnetic
                 bubble memory systems; magnetic film; permuting
                 records; stores; time",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pole:1980:IWM,
  author =       "R. V. Pole and A. J. Spiekerman and T. W. Hansch",
  title =        "Interferometric Wavelength Measurements Through
                 Post-Detection Signal Processing",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "85--88",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Modern electronic signal processing techniques make it
                 possible to use a conventional scanning Fabry-Peror
                 interferometer for highly accurate measurement of
                 (tunable) laser wavelengths. An experimental device is
                 described in which the time intervals between
                 resonances of an unknown wavelength are compared with
                 those of a stabilized He-Ne reference laser by the use
                 of highly accurate electronic timing devices. The
                 accuracy is further enhanced through signal averaging
                 over many scan periods.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0760L (Optical interferometry); A4230 (Optical
                 information, image formation and analysis); A4260H
                 (Laser beam characteristics and interactions); B4330
                 (Laser beam interactions and properties); B6140C
                 (Optical information, image and video signal
                 processing); B7320P (Optical variables measurement)",
  classification = "744; 941; 942",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "10/sup -; 7/ accuracy; detection signal processing;
                 devices; electronic signal processing; experimental
                 device; frequency measurement; He-Ne reference laser;
                 highly accurate electronic timing; highly accurate
                 measurement; interferometer; interferometers;
                 interferometric wavelength measurements; laser beams;
                 lasers --- Testing; light interferometry; optical
                 variables measurement; post; scanning Fabry Perot;
                 signal averaging; signal processing; stabilized;
                 tunable laser wavelengths; wavelength measurement;
                 wavemeters",
  treatment =    "N New Development; X Experimental",
}

@Article{Braunecker:1980:POU,
  author =       "B. U. Braunecker",
  title =        "Pattern Optimization for {UPC} Supermarket Scanner",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "1",
  pages =        "89--94",
  month =        jan,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Different scanning patterns chi are analyzed in order
                 to determine the degree of redundancy. To this purpose,
                 the number of resolution points is evaluated which are
                 generated by a sweeping laser beam, while the
                 merchandise is moved across the scanning window. The
                 goal is to find the pattern which minimizes $N_\chi$
                 for an acceptable detection rate.",
  acknowledgement = ack-nhfb,
  classcodes =   "B4360 (Laser applications)",
  classification = "741; 922",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bar code scanner; laser beam applications; optical;
                 pattern recognition systems; probability; redundancy;
                 scanning pattern optimisation; sweeping laser beam;
                 universal product code; UPC supermarket scanner",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Anacker:1980:JCT,
  author =       "W. Anacker",
  title =        "{Josephson} Computer Technology: an {IBM} Research
                 Project",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "107--112",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper traces the origins and history of Josephson
                 technology as it led to the project and outlines the
                 project's scope. The potential of the technology for
                 ultrahigh-performance computer mainframes is discussed
                 and the major technological characteristics of LSI
                 Josephson devices are examined. The paper then provides
                 an overview outline of the remaining papers presented
                 in this issue.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265 (Digital electronics); B3240C (Superconducting
                 junction devices)",
  classification = "704; 721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer technology; computers --- Circuits; Josephson
                 effect; junction devices; large scale integration;
                 logic circuits; LSI Josephson devices; superconducting;
                 superconducting devices",
  treatment =    "G General Review",
}

@Article{Matisoo:1980:OJT,
  author =       "J. Matisoo",
  title =        "Overview of {Josephson} Technology Logic and Memory",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "113--129",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Basic concepts of superconductivity and electron
                 tunneling underlying the operation of Josephson devices
                 are outlined and an overview of the literature on the
                 subject is presented, with emphasis on work performed
                 at the IBM research laboratories since the beginnings
                 of the Josephson computer technology program in 1965.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B1265D (Memory circuits);
                 B3240C (Superconducting junction devices)",
  classification = "704; 722; 723; 921",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers --- Circuits; electron tunneling; integrated
                 logic circuits; integrated memory circuits; Josephson
                 devices; Josephson effect; junction devices; logic
                 circuits; memory circuits; superconducting;
                 superconducting devices; superconducting junction
                 devices",
  treatment =    "G General Review",
}

@Article{Gheewala:1980:DJC,
  author =       "T. R. Gheewala",
  title =        "Design of 2.5-Micrometer {Josephson} Current Injection
                 Logic (Cil)",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "130--142",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design of the basic logic circuits, the two-and
                 four-input OR and AND gates, and a timed inverter
                 circuit, is presented in full detail and the logic
                 delay and its sensitivity to design and fabrication
                 parameters are investigated using detailed models of
                 devices based on a 2.5- $\mu$ m technology. The nominal
                 logic delay of the circuits is estimated at 36 ps per
                 gate for an average fan-in of 4.5 and fan-out of 3. The
                 corresponding average power dissipation is 3.4
                 microwatts per gate. Finally, experimental delay
                 measurements are presented for two-input and four-input
                 OR and AND gates. The delay experiments are in
                 excellent agreement with computer simulations.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B3240C (Superconducting
                 junction devices); C5120 (Logic and switching
                 circuits)",
  classification = "704; 721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AND gates; average; computers --- Circuits; integrated
                 logic circuits; integration; Josephson current
                 injection logic; Josephson effect; large scale; logic
                 circuits; logic delay; LSI; OR gates; power
                 dissipation; superconducting devices; superconducting
                 junction devices; timed inverter circuit",
  treatment =    "P Practical; X Experimental",
}

@Article{Faris:1980:BDJ,
  author =       "S. M. Faris and W. H. Henkels and E. A. Valsamakis and
                 H. H. Zappe",
  title =        "Basic Design of a {Josephson} Technology Cache
                 Memory",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "143--154",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper, presenting a design for a 2.5- $\mu$ m
                 technology, 4 multiplied by 1K-bit cache chip with a
                 nominal access time of about 500 ps as a basis it is
                 shown how these components are structured and
                 interfaced. The cell, drivers, decoder, and a sense bus
                 are based on designs which were experimentally verified
                 in a 5- $\mu$ m technology for which excellent
                 agreement was found between computer simulations and
                 measurements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B3240C (Superconducting
                 junction devices)",
  classification = "704; 721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cache memory; computers --- Circuits; integrated
                 memory circuits; integration; Josephson effect;
                 Josephson technology; junction devices; large scale;
                 logic circuits; nondestructive read out; nondestructive
                 readout; superconducting; superconducting devices",
  treatment =    "P Practical",
}

@Article{Gueret:1980:IJC,
  author =       "P. Gueret and A. Moser and P. Wolf",
  title =        "Investigations for a {Josephson} Computer Main Memory
                 with Single-Flux-Quantum Cells",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "155--166",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper first summarizes requirements for a main
                 memory with Josephson junctions and reviews the work
                 carried out on an experimental main memory model
                 containing an array of single-flux-quantum cells, line
                 drivers, and address decoders with a total of nearly
                 4500 Josephson junctions. In the second part,
                 theoretical and experimental investigations on the y
                 drive system, including sense circuit, are presented.
                 The investigations deal with both the read and write
                 phases. Finally, the on-chip logic circuits and the
                 address decoders are discussed, and the experimental
                 results presented. Drivers and decoders based on the
                 principle of current steering in superconducting loops
                 are intended to be used on a fully populated
                 main-memory chip.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B3240C (Superconducting
                 junction devices); C5320Z (Other digital storage)",
  classification = "704; 721; 722; 723",
  corpsource =   "IBM Switzerland, Zurich, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access time; address; cellular arrays; computers ---
                 Circuits; decoders; effect; integrated memory circuits;
                 Josephson; large scale integration; line drivers; logic
                 circuits; LSI; power consumption; RAM; random-access
                 storage; single flux quantum cellular array;
                 superconducting devices; superconducting junction
                 devices",
  treatment =    "P Practical; X Experimental",
}

@Article{Brown:1980:OJP,
  author =       "Alan V. Brown",
  title =        "An Overview of {Josephson} Packaging",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "167--171",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An overall packaging philosophy for high-speed
                 Josephson computers is outlined in this paper. The
                 unique characteristics of such a package, operating at
                 liquid helium temperature, are described, and a
                 description is given of the technologies needed to
                 build the package.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B1265B (Logic circuits);
                 B1265D (Memory circuits); B3240C (Superconducting
                 junction devices); C5420 (Mainframes and
                 minicomputers)",
  classification = "704; 721; 722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cache memory; capability; computers --- Circuits;
                 cycle time; digital computers; electronics packaging;
                 high speed Josephson computers; logic; main memory;
                 minimum linewidth; modules; modules configuration;
                 superconducting devices; superconducting junction
                 devices",
  treatment =    "P Practical",
}

@Article{Jones:1980:CCS,
  author =       "H. C. Jones and D. J. Herrell",
  title =        "The Characteristics of Chip-To-Chip Signal Propagation
                 in a Package Suitable for Superconducting Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "172--177",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Authors have measured the electrical characteristics
                 of chip-to-chip-carrier connectors ideally suited to
                 high-performance Josephson LSI circuits. Self-and
                 mutual inductances between connectors were measured by
                 incorporating the connectors in a DC SQUID
                 (Superconducting Quantum Interference Device) and
                 confirmed by detailed signal delay and crosstalk
                 measurements made with Josephson logic circuits.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B1265B (Logic circuits);
                 B3240C (Superconducting junction devices)",
  classification = "704; 721; 722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chip to chip carrier; computers --- Circuits;
                 connectors; crosstalk measurements; DC SQUID; effect;
                 electric connectors; integrated logic circuits;
                 Josephson; Josephson LSI circuits; junction devices;
                 large scale integration; logic circuits; mutual
                 inductances; packaging; self inductance measurement;
                 signal delay; superconducting; superconducting
                 devices",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Broom:1980:MCJ,
  author =       "R. F. Broom and W. Kotyczka and A. Moser",
  title =        "Modeling of Characteristics for {Josephson} Junctions
                 Having Nonuniform Width or {Josephson} Current
                 Density",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "178--187",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The characteristics of a wide variety of junction
                 shapes, including interferometers having two or more
                 junctions, have been accurately calculated, permitting
                 the design of devices for specific purposes.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7450 (Superconductor tunnelling phenomena, proximity
                 effects, and Josephson effect); B3240C (Superconducting
                 junction devices)",
  classification = "704; 721; 922",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers --- Circuits; dynamic models; effect;
                 external magnetic field; inductance; interferometers;
                 Josephson; Josephson effect; logic circuits; maximum DC
                 Josephson current; static models; superconducting
                 devices; superconducting junction devices; tunnel
                 junctions",
  treatment =    "T Theoretical or Mathematical",
  xxauthor =     "R. F. Broom and A. Moser and W. Kotyczka",
}

@Article{Ames:1980:OMP,
  author =       "I. Ames",
  title =        "Overview of Materials and Process Aspects of
                 {Josephson} Integrated Circuit Fabrication",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "188--194",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Superconducting Pb-alloy thin films are used for
                 forming the junction electrodes, and a combination of
                 thermal and RF oxidation is used for forming the tunnel
                 barrier oxides. In addition to the junctions, the
                 circuits, which are formed above an insulated,
                 superconducting Nb ground plane, also contain:
                 superconducting Pb-alloy lines, contacts, and
                 transformers; AuIn$_2$ damping and terminating
                 resistors; insulated crossings; etc. Insulation between
                 the ground plane and overlying conducting layers is
                 achieved through use of a combination of Nb$_2$O$_5$
                 and SiO. The latter is also used to achieve insulation
                 between overlying conducting layers and as a final
                 protective coating. Photoresist processes are used for
                 layer patterning.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B3240C (Superconducting junction
                 devices)",
  classification = "704",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "active elements; AuIn$_2$ resistors; crossings;
                 insulated; integrated circuit manufacture; integrated
                 circuit technology; integrated circuits; Josephson
                 effect; Josephson junctions; junction electrodes; layer
                 patterning; oxidation; oxides; Pb-alloy thin films;
                 photoresists; RF; superconducting devices;
                 superconducting junction devices; superconducting Nb
                 ground plane; thermal oxidation; tunnel barrier",
  treatment =    "P Practical",
}

@Article{Greiner:1980:FPJ,
  author =       "J. H. Greiner and C. J. Kircher and S. P. Klepner and
                 S. K. Lahiri and A. J. Warnecke and S. Basavaiah and J.
                 M. Baker and P. R. Brosious and H.-C. W. Huang and M.
                 Murakami and I. Ames and E. T. Yen",
  title =        "Fabrication Process for {Josephson} Integrated
                 Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "195--205",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the fabrication process used to
                 prepare recent Josephson devices and circuits. The
                 multilayer, integrated circuits were formed on oxidized
                 Si substrates primarily through use of vacuum-deposited
                 thin films. Superconducting layers were generally Pb
                 alloys and insulation layers, SiO. These layers were
                 patterned using photoresist stencil lift-off methods
                 and optical lithography with minimum linewidths of 2.5
                 $\mu$ m. An overview of the fabrication process is
                 presented, and preparation and properties of the
                 various layers are described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B3240C (Superconducting junction
                 devices)",
  classification = "704; 713; 721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AuIn$_2$ resistors; circuits; computers --- Circuits;
                 controls; damping resistors; device geometry;
                 electrodes; integrated circuit manufacture; integrated
                 circuit technology; interferometer; Josephson effect;
                 Josephson integrated circuits; junction; layer
                 patterning; logic circuits; memory; minimum linewidths;
                 photoresist stencil lift off; photoresists; SiO films;
                 sputter etching; subtractive etching; superconducting
                 devices; superconducting junction devices; tunnel
                 barrier formation; vacuum deposited Pb-alloy",
  treatment =    "P Practical",
  xxauthor =     "J. H. Greiner and C. J. Kircher and S. P. Klepner and
                 S. K. Lahiri and A. J. Warnecke and S. Basavaiah and E.
                 T. Yen and John M. Baker and P. R. Brosious and H. C.
                 W. Huang and M. Murakami and I. Ames",
}

@Article{Broom:1980:EPV,
  author =       "R. F. Broom and R. Jaggi and Th. O. Mohr and A.
                 Oosenbrug",
  title =        "Effect of Process Variables on Electrical Properties
                 of {Pb}-alloy {Josephson} Junctions",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "206--211",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Studies on the effect of process variables on the
                 electrical properties of Josephson tunnel junctions
                 were directed toward optimization of the process for
                 cryogenic memory applications, for which special
                 importance is placed on the DC Josephson current
                 density j$_1$, its stability and reproducibility, and
                 the junction quality. Variables studied included RF
                 voltage, oxygen plasma pressure, the presence of oxygen
                 during deposition of the counter electrode, the
                 composition and surface state of the base electrode,
                 junction geometry, radial position on the wafer, and
                 storage and annealing conditions.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7450 (Superconductor tunnelling phenomena, proximity
                 effects, and Josephson effect); B3240C (Superconducting
                 junction devices)",
  classification = "704",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealing factors; base electrode; characteristics;
                 counter electrode; cryogenic memory applications; DC;
                 devices; Josephson current density; Josephson effect;
                 junction geometry; lead alloys; O plasma pressure;
                 Pb-alloy Josephson junctions; Pb-Au-In alloys; radial
                 wafer position; RF voltage; superconducting devices;
                 superconducting junction; tunnel",
  treatment =    "X Experimental",
}

@Article{Broom:1980:FPN,
  author =       "R. F. Broom and Th. O. Mohr and W. Walter and R. B.
                 Laibowitz",
  title =        "Fabrication and Properties of Niobium {Josephson}
                 Tunnel Junctions",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "212--222",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The main emphasis is on improvement of the tunneling
                 characteristics through studies of the conditions
                 influencing the formation of the tunnel barrier. In
                 situ ellipsometric measurements have been made during
                 growth of the tunnel oxide on the base electrode of the
                 junctions in an RF plasma. The results are compared
                 with electrical measurements on completed junctions.
                 Two additional processes are found to have an important
                 influence on the junction characteristics: precleaning
                 of the base electrode in an Ar plasma before oxidation
                 and a further treatment of the grown oxide in a
                 low-voltage, high-pressure plasma.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7450 (Superconductor tunnelling phenomena, proximity
                 effects, and Josephson effect); B3240C (Superconducting
                 junction devices)",
  classification = "704",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "annealing; Ar plasma; arrays; base electrode; cycling;
                 ellipsometric measurements; high density memory;
                 interferometers; Josephson effect; junctions; niobium;
                 RF plasma; storage effects; superconducting devices;
                 superconducting junction devices; thermal; thin film Nb
                 Josephson tunnel; tunnel barrier; tunnelling
                 characteristics",
  treatment =    "X Experimental",
  xxauthor =     "R. F. Broom and R. B. Laibowitz and Th. O. Mohr and W.
                 Walter",
}

@Article{Baker:1980:STB,
  author =       "John M. Baker and C. J. Kircher and J. W. Matthews",
  title =        "Structure of Tunnel Barrier Oxide for {Pb}-alloy
                 {Josephson} Junctions",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "223--234",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The oxide formed on Pb-In and Pb-In-Au alloy films by
                 processes similar to those used to fabricate oxide
                 tunnel barriers for experimental Josephson junction
                 devices has been investigated with transmission
                 electron microscopy and diffraction (TEM\slash TED),
                 Auger electron and x-ray photoelectron spectroscopies
                 (AES and XPS), and ellipsometry.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7450 (Superconductor tunnelling phenomena, proximity
                 effects, and Josephson effect); B3240C (Superconducting
                 junction devices)",
  classification = "704",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Au alloys; Auger effect; Auger electron spectroscopy;
                 base electrode films; continuous stable epitaxial
                 layer; cubic; devices; electron microscopy;
                 ellipsometry; gold alloys; In$_2$O/sub 3/; indium
                 alloys; Josephson effect; Josephson junctions; lead
                 alloys; oxidation; Pb-In alloys; Pb-In-; PbO; ray
                 photoelectron spectra; superconducting devices;
                 superconducting junction; superconducting junction
                 devices; surface layer; transmission; transmission
                 electron microscope examination of materials; tunnel
                 barrier oxide; X-; X-ray photoelectron spectroscopies",
  treatment =    "X Experimental",
}

@Article{Kircher:1980:PAR,
  author =       "C. J. Kircher and S. K. Lahiri",
  title =        "Properties of {AuIn}$_2$ Resistors for {Josephson}
                 Integrated Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "235--242",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The influences of film thickness and composition on
                 the resistivity and microstructure of AuIn$_2$ films,
                 which are used as resistors in Josephson integrated
                 circuits, have been investigated. In addition, because
                 previous work indicated that the resistivity of
                 AuIn$_2$ films may be due to electron scattering from
                 grain boundaries or other defects in the films,
                 representative Au-In alloy films were investigated by
                 transmission electron microscopy (TEM) to characterize
                 their microstructures. Results of these experiments
                 have been used to analyze the factors that govern the
                 film resistivities.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220E (Thin film circuits); B3240C (Superconducting
                 junction devices)",
  classification = "704",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AuIn$_2$ thin film resistors; electron microscopy
                 analysis; film resistors; Fuchs surface scattering;
                 grain size; Josephson effect; Josephson integrated
                 circuits; reflection coefficients; resistances;
                 resistivity; Shatzkes grain boundary scattering; sheet;
                 SiO coated Si wafers Mayadas; superconducting devices;
                 superconducting junction devices; thin",
  treatment =    "P Practical",
}

@Article{Tsui:1980:JRS,
  author =       "Frank F. Tsui",
  title =        "{JSP} --- a Research Signal Processor in {Josephson}
                 Technology",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "2",
  pages =        "243--252",
  month =        mar,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Josephson Signal Processor (JSP) discussed in this
                 paper is a small, special-purpose computer to be built
                 with the Josephson tunneling technology using the
                 Research Signal Processor (RSP) as a precursor. The
                 main purpose of the JSP is to demonstrate the
                 feasibility of using Josephson technology to realize an
                 ultrahigh-speed computer system.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5260 (Digital signal processing); C5420 (Mainframes
                 and minicomputers)",
  classification = "704; 716; 721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computerised signal processing; current; cycle time;
                 destructive read out; injection logic technology;
                 Josephson technology; memory; nondestructive read out;
                 read only; research signal processor; signal processing
                 --- Computer Applications; single turn logic
                 technology; special purpose computers; superconducting
                 devices; superconducting junction devices; two junction
                 interferometers",
  treatment =    "P Practical",
}

@Article{Larsen:1980:SAD,
  author =       "Richard A. Larsen",
  title =        "A silicon and aluminum dynamic memory technology",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "268--282",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Silicon and Aluminum Metal Oxide Semiconductor
                 (SAMOS) technology is presented as a high-yield,
                 low-cost process to make one-device-cell random access
                 memories. The characteristics of the process are a
                 multilayer dielectric gate insulator (oxide-nitride), a
                 p-type polysilicon field shield, and a doped oxide
                 diffusion source. Added yield-enhancing features are
                 backside ion implant gettering, dual dielectric
                 insulators between metal layers, and circuit
                 redundancy. A family of chips is produced using SAMOS,
                 ranging from 18K bits to 64K. System features such as
                 on-chip data registers are designed on some chips. The
                 chip technology is merged with ``flip-chip'' packaging
                 to provide one-inch-square modules from 72K bits
                 through 512K bits, with typical access times from 90 ns
                 to 300 ns.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570F (Other MOS integrated
                 circuits)",
  classification = "714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "18K to 64K; backside ion implant gettering; circuit;
                 data storage, semiconductor; device per cell RAM;
                 dielectric insulators between metal layers; diffusion
                 source; doped oxide; dual; dynamic RAM technology;
                 field effect integrated circuits; flip chip packaging;
                 IBM; integrated circuit; integrated memory circuits;
                 integration; large scale; multilayer dielectric gate
                 insulator; one; p-type poly-Si field shield; RAM;
                 random-access storage; redundancy; SAMOS; semiconductor
                 devices, MOS; Si and Al MOS; technology",
  treatment =    "G General Review; X Experimental",
}

@Article{Gray:1980:CCS,
  author =       "Kenneth S. Gray",
  title =        "Cross-Coupled Charge-Transfer Sense Amplifier and
                 Latch Sense Scheme for High-Density {FET} Memories",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "283--290",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Oct 25 10:36:26 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a sense scheme for use on
                 high-density one-device cell field effect transistor
                 random access memories (FET RAMs). The high-sensitivity
                 threshold-independent cross-coupled charge-transfer
                 sense amplifier and latch is used. The IBM 64K-bit
                 one-device dynamic memory cell FET RAM chip design is
                 used as the vehicle for the discussion. Adaptations
                 made on the sense amplifier and latch for use with the
                 sense scheme are discussed. Also described are (1)
                 dummy cell design, (2) subthreshold leakage
                 considerations, (3) single-ended input\slash output
                 (I/O) circuitry sensing and ramifications, (4) multiple
                 cycle signal degradations, and (5) a maximum supply
                 voltage ($V_H$) buffer circuit sense scheme
                 improvement.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570H (Other field effect
                 integrated circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amplifiers; buffer circuit sense scheme; cross coupled
                 charge transfer; data storage, semiconductor;
                 degradations; FET; field effect integrated circuits;
                 IBM 64K RAM; integrated circuit; integrated memory
                 circuits; integration; large scale; multiple cycle
                 signal; one device per cell RAM; RAMs; random-access
                 storage; semiconductor devices, charge transfer; sense
                 amplifier; sense amplifier and latch sense scheme;
                 sense scheme; subthreshold leakage; technology; VLSI",
  treatment =    "G General Review; X Experimental",
}

@Article{Fitzgerald:1980:CIF,
  author =       "Brian F. Fitzgerald and Endre P. Thoma",
  title =        "Circuit Implementation of Fusible Redundant Addresses
                 on {RAMs} for Productivity Enhancement",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "291--298",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Oct 25 10:38:02 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the circuit schemes used to
                 substitute redundant storage locations for defective
                 ones found during testing. Word or bit lines are added
                 along with appropriate bit steering circuitry to allow
                 the replacement of a defective word or bit line.
                 On-chip storage elements are ``set'' by the tester and
                 used to store the binary addresses of the failing word
                 or bit lines, which are then compared to the incoming
                 addresses by the redundancy circuitry. This circuitry
                 then activates the replacement word or bit lines and,
                 by various means described, steers out the defective
                 ones. A variation is described briefly which includes a
                 word redundant circuit scheme that provides no penalty
                 in memory access time by using separate sense
                 amplifiers for the redundant lines.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bit steering circuitry; circuit; circuit schemes; data
                 storage, semiconductor; defective storage locations
                 replacement; fusible redundant addresses;
                 implementation; integrated circuit technology;
                 integrated memory circuits; large scale integration;
                 LSI; productivity enhancement; ram; RAMs; random-access
                 storage; redundancy; redundant storage",
  treatment =    "G General Review",
}

@Article{Troutman:1980:VDP,
  author =       "Ronald R. Troutman",
  title =        "{VLSI} Device Phenomena in Dynamic Memory and Their
                 Application to Technology Development and Device
                 Design",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "299--309",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Several dimensional limitations arise from the
                 electrical characteristics both of intentionally
                 switching devices and of possible parasitic devices.
                 Account must be taken of threshold dependence on both
                 channel length and width. Furthermore, any isolation
                 scheme must not introduce leakage from the storage
                 node, such as parasitic subthreshold and low-level
                 punch-through currents. Hot electron emission depends
                 on both horizontal and vertical dimensions and must be
                 minimized to guarantee the requisite long-term device
                 behavior. This paper discusses the physical origins of
                 the above fundamental device phenomena, their influence
                 on SAMOS device design, and implications for future
                 memory technologies.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570F (Other MOS integrated
                 circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, semiconductor; dynamic RAM; electrical
                 characteristics; field effect integrated circuits;
                 integrated circuit; integrated circuits --- Very Large
                 Scale Integration; integrated memory circuits;
                 integration; intentionally switching devices; large
                 scale; parasitic devices; random-access storage; SAMOS;
                 technology; VLSI device phenomena",
  treatment =    "G General Review",
}

@Article{Geipel:1980:RLI,
  author =       "Henry J. {Geipel, Jr.} and Warren K. Tice",
  title =        "Reduction of Leakage by Implantation Gettering in
                 {VLSI} Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "310--317",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Damage introduced by ion implantation on the back side
                 of the wafer is used to reduce the MOS transient
                 (relaxation) and junction leakage; the technique is
                 applied to dynamic memory cells.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2550B (Semiconductor
                 doping); B2570H (Other field effect integrated
                 circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access storage; Ar; argon; B; boron; circuit
                 technology; data storage, semiconductor --- Storage
                 Devices; dynamic RAM; field effect integrated circuits;
                 gettering; implantation; integrated; integrated
                 circuits; integrated memory circuits; ion; ion
                 implantation; Kr; krypton; large scale integration;
                 leakage reduction; random-; reducing; relaxation
                 leakage; VLSI; Xe; xenon",
  treatment =    "X Experimental",
}

@Article{Lo:1980:FDR,
  author =       "T. C. Lo and Roy E. Scheuerlein and Robert Tamlyn",
  title =        "{64K FET} Dynamic Random Access Memory: Design
                 Considerations and Description",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "318--327",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Oct 25 10:36:40 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The major design considerations and design features of
                 an experimental 64K-bit random access memory (RAM),
                 implemented in a double polysilicon gate technology,
                 are described in this paper. Design tradeoffs
                 addressing power supply selection and chip
                 configuration alternatives are presented. This is
                 followed by a description of the 8K-word by 8-bit FET
                 dynamic RAM which uses single-transistor cells with
                 first-level-metal bit lines and second-level-metal
                 stitched polysilicon word lines. Test results obtained
                 on early engineering hardware chips fabricated with
                 linear dimensions 1.2 times those of the base design
                 are also presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570H (Other field effect
                 integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "64K dynamic RAM; chip configuration alternatives; data
                 storage, semiconductor; design considerations; design
                 features; design tradeoffs; double poly-Si gate
                 technology; field effect integrated circuits;
                 integrated circuit; integrated memory circuits;
                 integration; large scale; power supply; ram;
                 random-access storage; selection; technology",
  treatment =    "G General Review",
}

@Article{Tzou:1980:CDM,
  author =       "Albert J. Tzou and Y. R. Gopalakrishna and Eugene M.
                 Blaser and Ori Bar-Gadda and Rodolfo A. Carballo",
  title =        "A {256K-bit} charge-coupled device memory",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "328--338",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the design of an experimental
                 256K-bit serial-access memory using VLSI fabrication
                 technology and low-power dynamic circuits. The unique
                 design features and the organization of the 256K CCD
                 chip are discussed; the array organization, the chip
                 layout, the peripheral circuitry, and the
                 buried-channel CCD device design are described; and
                 test results obtained on experimental hardware are
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570H (Other field effect
                 integrated circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "256K CCD; 300 ns/bit cycle; 310 mW dissipation; 64
                 blocks of 4K bits; array organisation; charge-coupled
                 device circuits; chip layout; circuitry; circuits; data
                 storage, semiconductor --- Storage Devices; double;
                 experimental hardware; field effect integrated;
                 integrated circuit technology; integrated circuits ---
                 Very Large Scale Integration; integrated memory; large
                 scale integration; memory; peripheral; poly-Si process;
                 semiconductor devices, charge coupled; serial access
                 memory; test results; VLSI fabrication technology",
  treatment =    "G General Review; X Experimental",
}

@Article{Rideout:1980:OMC,
  author =       "V. Leo Rideout and John J. Walker and Alice Cramer",
  title =        "One-Device Memory Cell Using a Single Layer of
                 Polysilicon and a Self-Registering Metal-To-Polysilicon
                 Contact",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "339--347",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The fabrication and operation of a novel one-device
                 dynamic memory cell are described. Like the
                 conventional double overlapping polysilicon cell, the
                 new memory cell has a diffused bit line and a metal
                 word line, uses five basic masking operations, and
                 provides essentially equivalent cell area for the same
                 lithographic feature size. Unlike the double
                 polysilicon cell, however, the new cell uses a single
                 layer of polysilicon to provide a more planar surface
                 topography, and a self-registered contact cell is the
                 use of two lithographic masking operations that define
                 two patterns in a single polysilicon layer, the MOSFET
                 gate electrode and the MOS capacitor electrode. The
                 self-registering contact also facilitates a powerful
                 polysilicon wiring technique that is applicable to the
                 access circuits located peripherally to the array of
                 memory cells.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2550G (Lithography); B2570F
                 (Other MOS integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, semiconductor; diffused bit line;
                 dynamic; fabrication; field effect integrated circuits;
                 five basic masking; integrated circuit; integrated
                 memory circuits; integration; large scale; metal word
                 line; MOS capacitor electrode; MOSFET gate electrode;
                 one device memory cell; operations; planar surface
                 topography; poly-Si wiring; RAM; ram; random-access
                 storage; selfregistered contact cell; single layer
                 poly-Si; small cell area; technology",
  treatment =    "N New Development",
  xxauthor =     "V. L. Rideout and A. Cramer and J. J. Walker",
}

@Article{Kasprzak:1980:NIS,
  author =       "Lucian A. Kasprzak and Arun K. Gaind",
  title =        "Near-Ideal {Si-SiO$_2$} Interfaces",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "348--352",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The objective of this paper is to demonstrate that
                 chemical vapor deposition (CVD) of SiO$_2$ on Si at
                 1000 degree C can result in a near-ideal oxide and
                 interface without the use of a high-temperature
                 annealing step on both (100) and (111) Si substrates.
                 By comparing values for properties such as $Q_ss$,
                 $N_fs$, the interface charge density $Q_ic$, etc., for
                 both unannealed thermal and CVD SiO$_2$ films, the
                 authors show that this process may be useful in the
                 fabrication of IGFETs as well as bipolar devices
                 because of the control of the Si-SiO$_2$ interface on
                 both (100) and (111) Si.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7320 (Electronic surface states); A7340Q
                 (Metal-insulator-semiconductor structures); B2530F
                 (Metal-insulator-semiconductor structures); B2550
                 (Semiconductor device technology); B2560R (Insulated
                 gate field effect transistors)",
  classification = "714",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2.27\% HCl additive; 20 nm/minute; chemical vapour
                 deposition; CVD coatings; deposition rates 10 to;
                 IGFET; insulated gate field effect transistors;
                 interface electron states; near ideal Si-SiO$_2$
                 interfaces; semiconductor devices; semiconductor
                 technology; semiconductor-insulator boundaries; silicon
                 compounds; SiO$_2$ CVD; transistors, field effect",
  treatment =    "X Experimental",
}

@Article{Ormond:1980:RSG,
  author =       "Douglas W. Ormond and J. R. Gardiner",
  title =        "Reliability of {SiO$_2$} Gate Dielectric with
                 Semi-Recessed Oxide Isolation",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "353--361",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reports the results of a study to minimize
                 defects in the gate oxide and in the single crystal
                 substrate of semirecessed oxide (Semi-ROX) structures.
                 It is shown that both an increase in oxidation mask
                 thickness and a decrease in wet field oxidation
                 temperature markedly reduce the incidence of low
                 voltage breakdown in the gate oxide. Microscopic
                 studies of samples which exhibited low voltage
                 breakdown showed that the Si$_3$N$_4$ oxidation mask
                 had failed to protect the surface of the region in
                 which the gate oxide was grown. Semi-ROX processing
                 also exhibited edge breakdown, most likely due to the
                 Kooi effect (nitrided Si surface). The use of a thicker
                 ``pad'' oxide and a decrease in the wet field oxide
                 thickness were beneficial in reducing the magnitude of
                 degradation in gate breakdown due to this edge
                 effect.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B1265D (Memory circuits); B2550E
                 (Surface treatment for semiconductor devices); B2570H
                 (Other field effect integrated circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "charge-coupled device circuits; circuits; data
                 storage, semiconductor --- Storage Devices; edge
                 breakdown; field effect integrated; gate breakdown;
                 integrated circuit manufacture; integrated circuit
                 technology; integrated circuits --- Very Large Scale
                 Integration; integrated memory; isolation; Kooi effect;
                 large scale integration; nitrided Si surface;
                 oxidation; random-access; reliability; semirecessed
                 oxide; semiROX structures; SiO$_2$ gate dielectric;
                 storage",
  treatment =    "X Experimental",
}

@Article{Rottmann:1980:OL,
  author =       "Hans R. Rottmann",
  title =        "Overlay in Lithography",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "361--368 (or 461--468??)",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Advances in lithography rely largely on the capability
                 of reducing overlay errors, which in turn depends on
                 the capability to make two-dimensional overlay
                 measurements. This paper describes a simple and
                 accurate method of determining singular overlay errors
                 of step-and-repeat exposure systems with a precision of
                 plus or minus 0.01 $\mu$ m (standard deviation).",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electron beam lithography; integrated circuit
                 manufacture; lithography; overlay error; standard
                 deviation; step and repeat exposure",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Geipel:1980:ISD,
  author =       "Henry J. {Geipel, Jr.} and Richard B. Shasteen",
  title =        "Implanted Source\slash Drain Junctions for Polysilicon
                 Gate Technologies",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "362--369",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Shallow (less than 1.0- $\mu$ m)** plus -p junctions
                 are required for dense dynamic FET memory. Ion
                 implantations is a natural technology to fulfill the
                 geometric requirements of shallow highly doped n** plus
                 regions in a dual polysilicon gate IGFET technology.
                 However, implantation of **3**1P and **7**5As at high
                 dose levels severely damages the crystal lattice and
                 subsequently is difficult to anneal. This tends to make
                 implanted junctions more leaky than their diffused
                 counterparts and causes them to have lower apparent
                 reverse breakdown voltages. The detrimental effect of
                 residual end of process damage, resulting from the
                 implantation, is correlated to the electrical
                 characteristics of the n** plus -p junction. A junction
                 process technology is described that can provide
                 leakage levels of less than 0.25 fA/ mu m**2 (25
                 nA\slash cm**2), sharp reverse I-V characteristics, and
                 junction depths of 0.25 to 1.0 $\mu$ m.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550B (Semiconductor doping); B2560R (Insulated gate
                 field effect transistors); B2570F (Other MOS integrated
                 circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arsenic; characteristics; data storage, semiconductor
                 --- Storage Devices; field effect integrated circuits;
                 field effect transistors; insulated gate; integrated
                 circuit technology; integrated circuits --- Very Large
                 Scale Integration; integrated memory circuits;
                 integration; ion implantation; junction depth 0.25 to 1
                 micron; junction process technology; large scale;
                 leakage current <0.25 fA/micron/sup 2/; MOSFET; p-n
                 homojunctions; phosphorus; sharp reverse IV;
                 transistors, field effect; VLSI",
  treatment =    "N New Development; X Experimental",
}

@Article{Verkuil:1980:CMH,
  author =       "Roger L. Verkuil and Huntington W. Curtis and Mun S.
                 Pak",
  title =        "Contactless Method for High-Sensitivity Measurement of
                 $p$-$n$ Junction Leakage",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "370--377",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Oct 25 10:37:13 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The goals of this paper are to demonstrate
                 theoretically and empirically that relatively
                 voltage-independent leakage currents can be rapidly and
                 conveniently monitored by a noncontacting technique,
                 and to present the novel instrumentation required to
                 practice this technique.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2530B (Semiconductor junctions); B2550 (Semiconductor
                 device technology)",
  classification = "714; 721",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2/; contactless p-n junction leakage; coupling; data
                 storage, semiconductor; diffused p-n junctions; eddy
                 current loading effect; forward bias conditions; high
                 sensitivity measurement; inductive; junction decay
                 times 10/sup -4/ to 1 s; junction leakage currents
                 10/sup -6/ to 10/sup -10/ A/cm/sup; leakage dependent
                 decay time; low; low noise VHF oscillator circuitry;
                 measurement method; p-n homojunctions; p-n junction
                 leakage; photoinduced voltage; semiconductor
                 technology",
  treatment =    "N New Development; X Experimental",
  xxauthor =     "R. L. Verkuil and M. S. Pak and H. W. Curtis",
}

@Article{Bhattacharyya:1980:CDT,
  author =       "Arup Bhattacharyya and Donald P. Gaffney and Richard
                 A. Kenyon and Pierre B. Mollier and James E. Selleck
                 and Frank W. Wiedman",
  title =        "{1/N} Circuit and Device Technology",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "378--389",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The 1/N memory cell is the bipolar analog of the FET
                 one-device cell. A thin dielectric and doped
                 polysilicon are combined with bipolar technology to
                 achieve a vertically integrated, high-density,
                 fast-performance memory chip. The circuit design,
                 device structure, and processing implementation for a
                 64K-bit dynamic, 1/N fractional-device, experimental
                 bipolar memory are presented. Test results for several
                 geometrical and structural variations, including
                 16K-bit storage arrays, are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2550 (Semiconductor device
                 technology); B2570B (Bipolar integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1/N memory cell; 16K; access storage; bipolar
                 integrated circuits; bipolar RAM; circuit; data
                 storage, semiconductor; design; device structure;
                 device technology; dynamic RAM; integrated circuit
                 technology; integrated memory circuits; large scale
                 integration; one device cell; processing
                 implementation; random-; storage arrays; VLSI",
  treatment =    "N New Development; X Experimental",
}

@Article{Bossen:1980:SSM,
  author =       "Douglas C. Bossen and M. Y. Hsiao",
  title =        "A system solution to the memory soft error problem",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "390--397",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper, instead of a device or package fix, a
                 system solution is presented which uses
                 error-correcting codes in combination with system
                 maintenance strategy. There is virtually no additional
                 cost in this solution to the alpha-particle problem and
                 yet it achieves the desired result. The paper also
                 describes the basic failure definitions and the memory
                 cell failure mode caused by alpha-particle and other
                 radiation sources; and reviews the base
                 error-correcting-code (ECC) system with respect to a
                 specific single-error-correcting and
                 double-error-detecting code example.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570H (Other field effect
                 integrated circuits); C5380 (Other aspects of storage
                 devices and techniques); C6150G (Diagnostic, testing,
                 debugging and evaluating systems)",
  classification = "714; 721",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "additional cost; alpha particle RAM chips;
                 charge-coupled device circuits; correcting code; data
                 storage, semiconductor; density RAM chips; double error
                 detecting code; error correction codes;
                 error-correcting codes; field effect integrated
                 circuits; high; integrated circuit; integrated memory
                 circuits; integration; large scale; main memory failure
                 rate; maintenance strategy; memory soft error problem;
                 microcode and hardware algorithm; microprogramming;
                 minimal; overall system approach; random-access
                 storage; reliability; single error; system; system
                 solution; technology",
  treatment =    "N New Development; P Practical",
}

@Article{Stapper:1980:YMP,
  author =       "C. H. Stapper and Andrew N. McLaren and Martin
                 Dreckmann",
  title =        "Yield Model for Productivity Optimization of {VLSI}
                 Memory Chips with Redundancy and Partially Good
                 Product",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "398--409",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A model with mixed Poisson statistics has been
                 developed for calculating the yield for memory chips
                 with redundant lines and for partially good product.
                 The mixing process requires two parameters which are
                 readily obtained from product data. The product is
                 described in the mode by critical areas which depend on
                 the circuit's sensitivity to defects, and they can be
                 determined in a systematic way. The process is
                 represented in the model by defect densities and gross
                 yield losses. These are measured with defect monitors
                 independently of product type. This paper shows how the
                 yield for any product can be calculated given the
                 critical areas, defect density, and mixing parameter.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B1265D
                 (Memory circuits); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "critical areas; data storage, semiconductor ---
                 Storage Devices; defect densities; gross yield losses;
                 integrated circuit; integrated circuit manufacture;
                 integrated circuits; integrated memory circuits;
                 integration; large scale; mixed; mixing parameter;
                 partially good product; Poisson statistics;
                 productivity optimisation; random-access storage;
                 redundancy; technology; VLSI memory chips; yield
                 model",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ho:1980:CIT,
  author =       "Irving T. Ho and Jacob Riseman and Herbert L.
                 Greenhaus",
  title =        "A charge injection transistor memory cell",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "3",
  pages =        "410--413",
  month =        may,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Two versions of an experimental bipolar dynamic memory
                 cell are described. The memory cell consists of one
                 p-channel MOSFET and a bipolar npn transistor with
                 extensive node sharing. The MOSFET device controls the
                 charge injection into the floating base of the npn
                 transistor, and the bipolar device provides
                 amplification for the stored charge during read
                 operation. For memories, this cell offers performance
                 associated with bipolar technology and chip density
                 comparable to MOSFET memories.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar dynamic; charge injection transistor memory
                 cell; CITM; data storage, semiconductor; dynamic RAM;
                 integrated circuit technology; integrated memory
                 circuits; large scale integration; memory cell;
                 MOSFET/npn transistor memory cell; random-access
                 storage",
  treatment =    "X Experimental",
}

@Article{Kyser:1980:CSE,
  author =       "David F. Kyser and Richard Pyle",
  title =        "Computer Simulation of Electron-Beam Resist Profiles",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "426--437",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A user-oriented, conversational computer program, LMS
                 (Lithography Modeling System), has been developed for
                 rapid investigation of the total lithographic process
                 used in electron-beam lithography, including electron
                 exposure and resist development. Electron scattering
                 and energy deposition within the resist film are
                 simulated with Monte Carlo techniques, including the
                 significant effects of electrons backscattered from the
                 substrate. The magnitude of and correction for the
                 resulting intra-and inter-line proximity effects in the
                 latent image and their dependence on variables such as
                 beam voltage, film thickness, substrate material, and
                 line-pattern geometries are easily investigated with
                 LMS. The latent image in the resist film is transformed
                 into a solubility-rate image. The time evolution of the
                 developed-resist profile and its dependence on electron
                 dose, solvent, etc. can also be determined.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240G (Monte Carlo methods); B2550G (Lithography);
                 B2570 (Semiconductor integrated circuits); C7410D
                 (Electronic engineering computing)",
  classification = "711; 713; 714; 723; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "beam voltage; deposition; digital simulation; effect;
                 electron beam lithography; electron beam resist
                 profile; electron beams --- Applications; electron
                 exposure; energy; film thickness; integrated circuit
                 manufacture; interline proximity effect; intraline
                 proximity; line pattern geometry; lithography;
                 lithography modeling system; material; methods; Monte
                 Carlo; substrate",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Parikh:1980:PEE,
  author =       "Mihir Parikh",
  title =        "Proximity Effects in Electron Lithography: Magnitude
                 and Correction Techniques",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "438--451",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Proximity effects due to electron scattering in the
                 resist and substrate seem to set a fundamental limit to
                 the areal density that can be achieved in electron
                 lithography. This work briefly reviews the form and the
                 magnitude of the proximity function and its extent as
                 evidenced by deviations in designed linewidths. It also
                 discusses methods to decrease the proximity effect as
                 well as the algorithms used for correction of such
                 effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "711; 713; 714; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; areal density; electron beam lithography;
                 electron beams --- Applications; electron lithography;
                 electron scattering; integrated circuit manufacture;
                 lithography; magnitude and correction technique;
                 proximity effect; proximity function; shape
                 descriptor",
  treatment =    "A Application; X Experimental",
}

@Article{Hatzakis:1980:SOL,
  author =       "Michael Hatzakis and Benjamin J. Canavello and Jane M.
                 Shaw",
  title =        "Single-Step Optical Lift-Off Process",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "452--460",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A process is described that allows the use of the
                 lift-off metallization technique with ultraviolet
                 exposure of a single layer of AZ-type photoresist. The
                 process consists of soaking the resist layer for a
                 predetermined time either in chlorobenzene or other
                 aromatic solvents such as toluene and benzene before or
                 after exposure. After development, resist profiles with
                 overhangs suitable for lift-off metallization are
                 obtained. It appears that removal of solvent and
                 low-molecular-weight resin from the AZ resist may be
                 responsible for the observed differential development
                 rates. In addition, the soak time and temperature
                 behavior indicate a diffusion-type process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "539; 713; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aromatic solvent; chlorobenzene solvent; integrated
                 circuit manufacture; lift; lithography; metallizing;
                 off metallisation; photoresist; resist layer; soak
                 time; technique; wet etching",
  treatment =    "A Application; P Practical",
}

@Article{Shatzkes:1980:DBC,
  author =       "Morris Shatzkes and Moshe Av-Ron and Robert A. Gdula",
  title =        "Defect-Related Breakdown and Conduction in {SiO$_2$}",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "469--479",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A statistical model incorporating the effects of
                 defects provides a good representation of breakdown
                 results for Al-SiO$_2$-Si MOS capacitors. Implications
                 of this model for interpretation of the yield from life
                 tests and histograms obtained from ramp tests are
                 discussed for the case of a Poisson distribution of
                 defects over the capacitors. The breakdown rates of MOS
                 capacitors in life tests are found to be correlated to
                 defects inferred from conduction measurements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2130 (Capacitors); B2560S (Other field effect
                 devices)",
  classification = "712",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "capacitors; defect related breakdown; devices;
                 histogram; life test; logic testing;
                 metal-insulator-semiconductor; Poisson distribution;
                 ramp test; reliability; semiconducting silicon
                 compounds",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Donath:1980:SWP,
  author =       "Wilm E. Donath",
  title =        "Stand-Alone Wiring Program for {Josephson} Logic",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "480--485",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a channel routing wiring program
                 and its interface to the user. Of particular interest
                 are its interface facilities, which permit manual
                 update of the routing, pre-routing, and incremental
                 routing. A hierarchical organization of the logic is
                 feasible, which permits moving of complex entities,
                 such as latches, adders and others, as complete
                 entities. The internal wiring of these entities could
                 either be done manually and be fixed before layout,
                 which would be desirable when the wiring was used as a
                 delay line, or could be left to the wiring program,
                 which would route them more flexibly. The features
                 above are made possible by the special-interface
                 organization used here. In this interface the pins on
                 the devices can be directly addressed, relatively
                 addressed, and indirectly addressed; a simple
                 macrocompiler permits the hierarchical organization of
                 the data.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210B (Computer-aided logic design)",
  classification = "704; 721; 723",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adder; channel routing wiring program; computer
                 interfaces; data entry program; delay line; latch;
                 logic CAD; logic design; superconducting devices ---
                 Josephson Junctions",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Lin:1980:EGD,
  author =       "Shu Lin and Tadao Kasami and Saburo Yamamura",
  title =        "Existence of good delta-decodable codes for the
                 two-user multiple-access adder channel",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "486--495",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper defines a class of delta -decodable codes
                 for the two-user multiple-access adder channel with
                 binary inputs. This class is a generalization of the
                 class of two-user codes investigated by Kasami and Lin
                 (1978). Lower bounds on the achievable rates of codes
                 in this class are derived. For a wide range of error
                 correcting capability, this class contains good
                 two-user delta -decodable codes with rates lying above
                 the timesharing line.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  classification = "723",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binary input; codes, symbolic; encoding; multiple
                 access adder channel; two user code",
  treatment =    "X Experimental",
}

@Article{Lew:1980:OAL,
  author =       "John S. Lew",
  title =        "Optimal Accelerometer Layouts for Data Recovery in
                 Signature Verification",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "496--511",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Current experimental use of pen acceleration data for
                 signature verification has prompted the mathematical
                 theory of a recent paper on the subject, expounding
                 motion recovery techniques for a special pen with
                 imbedded accelerometers. This continuation seeks to
                 optimize the instrument layout as a mechanical filter
                 which services to extract the kinematic observables
                 from the experimental noise.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0710 (Mechanical measurement methods and
                 instruments); C3120E (Velocity, acceleration and
                 rotation control)",
  classification = "943",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accelerometers; layout geometry; signature
                 verification",
  treatment =    "A Application; X Experimental",
}

@Article{Adams:1980:PSF,
  author =       "George G. Adams",
  title =        "Procedures for the Study of the Flexible-Disk to Head
                 Interface",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "4",
  pages =        "512--517",
  month =        jul,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The response of a rotating flexible disk interacting
                 with a read-write head is analyzed. The disk deflection
                 due to an arbitrary distributed normal pressure is
                 coupled with the Reynolds lubrication equation for the
                 disk-to-head air bearing. Procedures which considerably
                 reduce the computation time necessary for obtaining a
                 converged solution are described. A parameter study is
                 then discussed and its results presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320 (Digital storage)",
  classification = "722",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic; disc to head air bearing;
                 head; head interface; magnetic disc and drum storage;
                 read write; Reynolds lubrication equation",
  treatment =    "A Application; X Experimental",
}

@Article{Parikh:1980:PPE,
  author =       "Mihir Parikh and Donald E. Schreiber",
  title =        "Pattern Partitioning for Enhanced Proximity-Effect
                 Corrections in Electron-Beam Lithography",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "530--536",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents new algorithms for judicious
                 partitioning (or subdivision) of arbitrary lithographic
                 patterns in order to achieve increased quality of
                 proximity-effect correction as well as increased
                 efficiency in the computation of such corrections.
                 Experimental results verifying the correctness of such
                 algorithms are also presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B2550 (Semiconductor device technology);
                 B2550G (Lithography)B2570 (Semiconductor integrated
                 circuits); C7410D (Electronic engineering computing)",
  classification = "745",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computing; correction; electron beam
                 lithography; electron beams --- Applications;
                 electronic engineering; electronic engineering
                 computing; lithography; pattern partitioning; proximity
                 effect",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Grobman:1980:PCE,
  author =       "W. D. Grobman and A. J. Speth and T. H. P. Chang",
  title =        "Proximity Correction Enhancements for $1-\mu m$ Dense
                 Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "537--544",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In the case of dense circuits with linewidths of about
                 1 $\mu$ m or smaller, two enhancements to the proximity
                 correction technique can be easily implemented. One is
                 a simple approach to shape breakup (partitioning) to
                 enable dose correction to be applied nonuniformly
                 within the original design shapes. The other technique
                 is a new type of algorithm for forming subsets of the
                 design to perform self-consistent dose correction.
                 These two enhancements are applied to LSI chip data for
                 dense circuits and are shown to permit fabrication of
                 circuits which would be more difficult to process using
                 the proximity correction techniques described
                 previously, due to the particular geometries present in
                 these circuit designs.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2570 (Semiconductor integrated circuits);
                 C7410D (Electronic engineering computing)",
  classification = "713; 745",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computing; dose correction; electron beam
                 lithography; electron beams --- Applications;
                 electronic engineering; electronic engineering
                 computing; enhancement; integrated circuit manufacture;
                 integrated circuit technology; large scale integration;
                 lithography; LSI; partitioning; pattern recognition;
                 proximity correction; proximity effect",
  treatment =    "P Practical",
}

@Article{Davis:1980:RMD,
  author =       "Donald E. Davis",
  title =        "Registration Mark Detection for Electron-Beam
                 Lithography --- {EL1} System",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "545--553",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In electron-beam lithography for the direct exposure
                 of wafers for integrated circuit manufacturing,
                 accurate registration is necessary to achieve the
                 required pattern overlay. This paper examines elements
                 that should be considered to optimize the registration
                 mark detection process in an automatic registration
                 system for an e-beam lithography tool. Included is a
                 section on the generation of the backscatter signals
                 and the proper combination of these signals to reduce
                 the detection uncertainty errors in a system with four
                 back scatter detectors. Signals obtained from
                 resist-coated marks with several vertical profiles are
                 presented for illustration and comparison with the
                 predicted results. Beam shot noise, resist effects, and
                 other factors that affect the signal-to-noise ratio are
                 discussed and some pattern overlay results from EL1 are
                 given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2570 (Semiconductor integrated circuits);
                 C7410D (Electronic engineering computing)",
  classification = "745",
  corpsource =   "IBM Data Systems Div. Lab., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic registration system; beam lithography; beam
                 shot noise; electron; electron beam lithography;
                 electron beams --- Applications; electronic; electronic
                 engineering computing; engineering computing; IBM EL1;
                 integrated circuit technology; lithography; pattern
                 overlay; registration mark detection; resist effects",
  treatment =    "P Practical",
}

@Article{Magerlein:1980:ERL,
  author =       "J. H. Magerlein and D. J. Webb",
  title =        "Electron-Beam Resists for Lift-Off Processing with
                 Potential Application to {Josephson} Integrated
                 Circuits",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "554--562",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Several electron-beam resists suitable for lift-off
                 processing have been investigated with particular
                 attention to the requirements for fabricating Pb-alloy
                 Josephson integrated circuits. The desired resist must
                 perform well with a baking temperature near 70 degree
                 C, provide a reproducible undercut edge profile with
                 good linewidth control, and adhere to the necessary
                 substrates. Diazo resists as well as the commonly used
                 PMMA and copolymer materials were studied. Initial
                 results suggest that AZ-1350J soaked in chlorobenzene
                 to enhance the undercut profile can satisfy many of
                 these requirements. At present, the amount of undercut
                 obtained is larger than desired, limiting the minimum
                 separation between exposed features to about 1.5 $\mu$
                 m.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2220C (General integrated circuit fabrication
                 techniques); B3240C (Superconducting junction
                 devices)",
  classification = "713; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "diazo resists; effect; electron beam; electron beams
                 --- Applications; electron resists; integrated circuit
                 manufacture; integrated circuit technology; Josephson;
                 Josephson integrated circuits; junction devices; lead
                 alloys; lift off processing; linewidth control; Pb
                 alloy; PMMA; resists; superconducting; superconducting
                 devices --- Josephson Junctions; superconducting
                 junction devices; undercut edge profile",
  treatment =    "A Application; X Experimental",
}

@Article{Bard:1980:ESP,
  author =       "Yonathan Bard",
  title =        "Estimation of State Probabilities Using the Maximum
                 Entropy Principle",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "563--569",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "93E10 (68B20 94A12)",
  MRnumber =     "81h:93097",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "438.60086",
  abstract =     "A simple method is derived for computing state
                 probabilities of a system when the probabilities of
                 certain aggregate states are known. The method is based
                 on maximizing the system entropy. It is shown that the
                 results obtained by the method satisfy certain
                 assumptions on statistical independence between events.
                 The method is applied to a problem arising in computer
                 performance analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "C0310 (EDP management); C5420 (Mainframes and
                 minicomputers)",
  classification = "922",
  corpsource =   "IBM Cambridge Sci. Center, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer performance analysis; computer selection and
                 evaluation; entropy; maximum; maximum entropy
                 principle; principle; probability; state probability
                 estimation",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Heidelberger:1980:VRT,
  author =       "Philip Heidelberger",
  title =        "Variance reduction techniques for the simulation of
                 {Markov} processes. {I}. {Multiple} estimates",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "570--581",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65C20 (62M05)",
  MRnumber =     "81k:65014",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "438.60085",
  abstract =     "A method for reducing the variance of
                 simulation-generated estimates is proposed and
                 discussed. The method may be applied to the estimation
                 of steady state parameters of discrete and continuous
                 time Markov chains, semi-Markov processes, and
                 regenerative discrete time Markov processes on a
                 general state space (such as the waiting time process
                 in a multiple-server queue). The method is similar to
                 the technique of control variables, but differs in that
                 the means of the controls need not be explicitly known.
                 Numerical results for a variety of simple queueing
                 models are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); C1140C (Queueing theory);
                 C1140Z (Other topics in statistics); C1220 (Simulation,
                 modelling and identification)",
  classification = "922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "continuous time; digital; digital simulation; discrete
                 time Markov chains; estimation of steady state
                 parameters; Markov chains; Markov processes; multiple
                 server queue; parameter estimation; probability;
                 queueing models; queueing theory; regenerative discrete
                 time Markov processes; semi Markov processes;
                 simulation; variance reduction technique",
  reviewer =     "George Marsaglia",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Markowsky:1980:FWF,
  author =       "George Markowsky and Michael A. Wesley",
  title =        "Fleshing out Wire Frames",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "582--597",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68C05 (51-04 51M05 53A17)",
  MRnumber =     "82f:68035",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Given a polyhedral object, its wire frame is the set
                 of its edges and vertices. This paper presents
                 algorithm which discovers all objects with a given wire
                 frame. This algorithm, which has a number of
                 applications to mechanical design besides being of
                 mathematical interest, has been implemented and has
                 performed well on complex objects.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7440 (Civil and mechanical engineering computing)",
  classification = "723; 901",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; computer graphics; engineering --- Design Aids;
                 mechanical engineering computing; polyhedral; wire
                 frame",
  reviewer =     "L. Gyarmathi",
  treatment =    "P Practical",
}

@Article{Beeteson:1980:DSC,
  author =       "J. S. Beeteson and Kris T. Jarzebowski and Brian R.
                 Sowter",
  title =        "Digital System for Convergence of Three-Beam
                 High-Resolution Color Data Displays",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "598--611",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a new method of generating and
                 adjusting convergence waveforms required by a delta-gun
                 cathode-ray tube for digital color display applications
                 to ensure that the primary color images produced by
                 three guns are correctly registered with respect to
                 each other.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2360 (Electron beam scanned tubes); B7260 (Display
                 technology and systems); C5540 (Terminals and graphic
                 displays)",
  classification = "714; 741",
  corpsource =   "IBM UK Labs. Ltd., Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adjustment pattern; cathode ray tube; cathode-ray tube
                 displays; convergence coil current; convergence
                 waveforms; correction; crosshair; delta gun; digital
                 colour data; display; display devices; display
                 instrumentation; electron tubes, cathode ray; IBM 3279;
                 microprogram; phase delay; rounding errors;
                 sensitivity; spot distortion; temperature stability;
                 three beam high resolution display",
  treatment =    "P Practical",
}

@Article{Vergnieres:1980:MGA,
  author =       "Bernard Vergnieres",
  title =        "Macro Generation Algorithms for {LSI} Custom Chip
                 Design",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "612--621",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Presented in this paper are macro generation
                 algorithms which have been developed and implemented
                 for the optimization of physical and electrical designs
                 of LSI macro circuits. Any type of logical macro
                 circuit for a custom chip design can be automatically
                 generated and optimized through the use of the concepts
                 and numerical techniques for algorithmic layout
                 generation and electrical network design which are
                 described. The application of this design method to
                 programmable logic array macros, which allow the
                 generation of very attractive designs, is also
                 discussed and illustrates the efficiency and
                 flexibility of the macro generation concept.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B1265F (Microprocessors and
                 microcomputers); B2570 (Semiconductor integrated
                 circuits); C5130 (Microprocessor chips); C5210B
                 (Computer-aided logic design); C7410D (Electronic
                 engineering computing); C7430 (Computer engineering)",
  classification = "713; 721",
  corpsource =   "IBM Essonnes Component Dev. Lab., Corbeil-Essonnes,
                 France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; custom chip design; integrated circuit
                 technology; integrated circuits; large scale
                 integration; logic CAD; logic design; logical macro
                 circuit; LSI; macro generation; microprocessor chips;
                 programmable logic array macros",
  treatment =    "A Application; P Practical",
}

@Article{Lee:1980:IPM,
  author =       "Ho Chong Lee and Hi Dong Chai",
  title =        "Integral Point-Matching Method for Two-Dimensional
                 {Laplace} Field Problems with Periodic Boundaries",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "622--630",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An integral point-matching technique is applied to
                 two-dimensional Laplacian fields between periodic
                 boundaries. This formulation leads to an algorithm that
                 reduces the size of the matrix, economizing on computer
                 workspace and inversion time. Several example problems
                 solved on an APL terminal system are included.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0260 (Numerical approximation and analysis); A4110D
                 (Electrostatics, magnetostatics); B0290P (Differential
                 equations); B5100 (Electric and magnetic fields); C4170
                 (Differential equations); C7410D (Electronic
                 engineering computing)",
  classification = "703",
  corpsource =   "IBM Systems Products Div. Lab., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL terminal; differential equations; electric fields;
                 electric networks; electrical; electrical engineering
                 computing; engineering computing; integral point
                 matching; Laplace; magnetic fields; numerical methods;
                 partial; periodic boundaries; technique; transforms;
                 two dimensional Laplace field",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Petersen:1980:STS,
  author =       "Kurt E. Petersen",
  title =        "Silicon Torsional Scanning Mirror",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "631--637",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Conventional batch photolithography and thin film
                 techniques are employed to fabricate an
                 electrostatically driven torsional scanning mirror from
                 single-crystal silicon. This device is extremely simple
                 to make and operate, has operational characteristics
                 comparable to commercial magnetically driven
                 high-frequency scanners, and has exhibited a promising
                 reliability.",
  acknowledgement = ack-nhfb,
  classcodes =   "B4190 (Other optical system components)",
  classification = "741; 745",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "batch photolithography; electrostatically driven
                 torsional scanning mirror; lithography ---
                 Applications; mirrors; photolithography; semiconductor
                 devices; Si; thin film techniques",
  treatment =    "P Practical",
}

@Article{Franaszek:1980:GMC,
  author =       "Peter A. Franaszek",
  title =        "A general method for channel coding",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "5",
  pages =        "638--641",
  month =        sep,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A procedure is described for constructing minimum
                 delay codes for discrete noiseless channels. The method
                 is based on a simple recursive algorithm for finding a
                 set of coding paths.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; channel coding; codes; codes, symbolic;
                 discrete noiseless channels; encoding; minimum delay
                 codes; recursive",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Scarborough:1980:IOF,
  author =       "Randolph G. Scarborough and Harwood G. Kolsky",
  title =        "Improved Optimization of {FORTRAN} Object Programs",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "660--676",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "For many years the FORTRAN H Extended compiler has
                 produced highly optimized object programs for IBM
                 System\slash 360 and System\slash 370 computers. A
                 study of the object programs revealed, however, that
                 important additional optimizations were possible, and
                 the compiler has been enhanced accordingly. First, the
                 range of cases handled by the optimization techniques
                 already present in the compiler has been extended. For
                 example, more duplicate computations are eliminated,
                 and more invariant computations are moved from inner to
                 outer loops. Second, several new optimizations have
                 been added, with subscript computation and register
                 allocation receiving particular attention. Third,
                 certain optimization restrictions have been removed.
                 This paper describes these improvements and reports
                 their effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "723; 922",
  corpsource =   "IBM Palo Alto Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems --- Program Compilers;
                 computer programming languages; FORTRAN; FORTRAN H
                 Extended compiler; FORTRAN object programs; highly; IBM
                 System/360; optimization; optimized object programs;
                 program compilers; register allocation; subscript
                 computation; System/370",
  treatment =    "P Practical",
}

@Article{Boyle:1980:OCG,
  author =       "D. Boyle and P. Mundy and T. M. Spence",
  title =        "Optimization and Code Generation in a Compiler for
                 Several Machines",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "677--683",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes optimization techniques that have
                 been implemented in a compiler which was designed to
                 produce code comparable to that produced by hand.
                 Additional optimization methods were incorporated into
                 successive versions of the compiler. It was found that
                 no single method was effective with all compiled
                 programs but that each of the techniques described was
                 effective for some programs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  classification = "723; 922",
  corpsource =   "IBM Information Services Ltd., Portsmouth, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "code generation; compiler; computer operating systems;
                 optimization; optimization methods; portability;
                 program compilers; software; software portability",
  treatment =    "P Practical",
}

@Article{Marks:1980:CCC,
  author =       "Brian Marks",
  title =        "Compilation to Compact Code",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "684--691",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A compilation process is described that emphasizes
                 small object code rather than fast object code. The
                 approach entails synthesizing an instruction set and an
                 interpreter for that instruction set during compilation
                 of an individual source program. Numerical results are
                 given for compiling a systems programming subset of
                 PL/I to System\slash 370 code.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  classification = "722; 723",
  corpsource =   "IBM United Kingdom Labs., Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compact code; compilation process; computer operating
                 systems; instruction; interpreter; object code; of
                 PL/I; program compilers; set; source program;
                 System/370 code; systems programming subset",
  treatment =    "P Practical",
}

@Article{Cocke:1980:SRD,
  author =       "John Cocke and Peter W. Markstein",
  title =        "Strength Reduction for Division and Modulo with
                 Application to Accessing a Multilevel Store",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "692--694",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method for replacing certain division and modulo
                 operations by additions and subtractions is presented.
                 This optimization allows efficient and easy use of
                 partitioned arrays to access a multilevel store.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "additions; computer operating systems; computer
                 systems programming; division; modulo; multilevel
                 store; optimization; partitioned arrays; storage
                 allocation; strength reduction; subtractions",
  treatment =    "P Practical",
}

@Article{Allen:1980:ECS,
  author =       "F. E. Allen and J. L. Carter and J. Fabri and J.
                 Ferrante and W. H. Harrison and P. G. Loewner and L. H.
                 Trevillyan",
  title =        "The {Experimental Compiling System}",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "695--715",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Experimental Compiling System (ECS) described here
                 represents a new compiler construction methodology that
                 uses a compiler base which can be augmented to create a
                 compiler for any one of a wide class of source
                 languages. The resulting compiler permits the user to
                 select code quality ranging from highly optimized to
                 interpretive. The investigation is concentrating on
                 easy expression and efficient implementation of
                 language semantics; syntax analysis is ignored.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "code; computer operating systems; computer programming
                 languages; Experimental Compiling System; language
                 semantics; program compilers; quality; source
                 languages; syntax analysis",
  treatment =    "P Practical",
}

@Article{Lafuente:1980:STC,
  author =       "J. M. Lafuente",
  title =        "Some Techniques for Compile-Time Analysis of
                 User-Computer Interactions",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "716--731",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Compile-time techniques for analyzing user-computer
                 interactions and the relationships and dependencies
                 among items of data that exist during the execution of
                 interactive application programs are presented. These
                 techniques are useful in constructing efficient
                 compilers for languages in which such interactions and
                 data item relationships and dependencies are described
                 by nonprocedural statements. The practical value of
                 using nonprocedural descriptions is that they ease the
                 task of the application programmer.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other processors);
                 C6150J (Operating systems)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compile-time analysis; computer; computer operating
                 procedures; computer operating systems; computer
                 programming languages; data; efficient compilers;
                 interactive application programs; item relationships;
                 nonprocedural statements; operating procedures; program
                 compilers; user-computer interactions",
  treatment =    "P Practical",
}

@Article{Denil:1980:BL,
  author =       "N. J. Denil",
  title =        "A business language",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "732--746",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper describes a language and supporting
                 interactive system for use by the small businessman. To
                 help the businessman-user understand and apply an
                 application program expressed in the language, he can
                 watch the application run in a single-step mode. If
                 tailoring of the application program is necessary, the
                 system guides the user by diagnosing inconsistencies in
                 the modified program. The user controls production
                 processing from the same user interface. In the first
                 part of the paper, the language is described. Next some
                 example user sessions are outlined. Finally the
                 prototype implementation and some design issues are
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  classification = "723",
  corpsource =   "IBM General Systems Div. Lab., Atlanta, GA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "application program; business language;
                 businessman-user; computer programming languages; high
                 level; high level languages; interactive system;
                 languages; production processing",
  treatment =    "P Practical",
}

@Article{Sauer:1980:LEQ,
  author =       "Charles H. Sauer and Edward A. MacNair and Silvio
                 Salza",
  title =        "A language for extended queueing network models",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "747--755",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Queuing networks are popular as models of performance
                 of computer systems and communication networks. The
                 Research Queueing Package, Version 2 (RESQ2), is a
                 system for constructing and solving extended queuing
                 network models. The authors refer to the class of RESQ2
                 networks as ``extended'' because of characteristics
                 absent from most queuing models. RESQ2 incorporates a
                 high-level language to concisely describe the structure
                 of the model and to specify constraints on the
                 solution. A main feature of the language is the
                 capability to describe models in a hierarchical
                 fashion, allowing an analyst to define parametric
                 submodels which are analogous to macros or procedures
                 in programming languages. RESQ2 thus encourages use of
                 structured models to effectively evaluate complex
                 systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C7430 (Computer
                 engineering)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2; communication networks; computer networks; computer
                 programming languages; computer systems; extended
                 queueing network models; high level languages;
                 high-level language; parametric submodels; queueing
                 theory; Research Queueing Package; RESQ2; structured
                 models; Version",
  treatment =    "P Practical",
  xxtitle =      "A Language for Extended Queuing Network Models",
}

@Article{Becerril:1980:GCF,
  author =       "J. L. Becerril and J. Bondia and R. Casajuana and F.
                 Valer",
  title =        "Grammar Characterization of Flowgraphs",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "756--763",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68F05 (68B10)",
  MRnumber =     "81j:68086",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "444.68069",
  abstract =     "An extension of the scheme grammar concept given by
                 Urschler is formalized. It is also show that, in the
                 usual hierarchy of the theory of formal languages, the
                 language generated by the scheme grammar is regular
                 (type 3). The last section gives the description of a
                 system for the automatic structuring of programs, which
                 applies these concepts to the Mills algorithm with some
                 modifications.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic)",
  classification = "723",
  corpsource =   "IBM Madrid Sci. Center, Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic; computer programming languages; flowgraphs;
                 formal languages; grammars; graph theory; Mills
                 algorithm; scheme grammar; structuring",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lomet:1980:DDF,
  author =       "David B. Lomet",
  title =        "Data Definition Facility Based on a Value-Oriented
                 Storage Model",
  journal =      j-IBM-JRD,
  volume =       "24",
  number =       "6",
  pages =        "764--782",
  month =        nov,
  year =         "1980",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A data definition facility is presented that provides
                 a consistent description of both primitive and user
                 data. It is based on a value-oriented storage model
                 which carefully distinguishes between values and
                 objects. It is values that are typed in this model, and
                 operations of the type work explicitly on the values.
                 Objects are accessible only via reference values.
                 Objects are described via descriptors called templates,
                 which ultimately yield reference type values.
                 Operations, both primitive and user-defined, are part
                 of a ``machine interface,'' and all executable language
                 constructs can ultimately be defined as explicit
                 operations of the interface. Importantly, these
                 operations must respect the typing constraints imposed
                 by both the primitive types and the user extensions.
                 The interactions of definition facility, storage model,
                 and execution model are illustrated via a series of
                 examples in which commonly used data constructs are
                 defined.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming languages; data; data definition
                 facility; data processing; data structures; executable
                 language constructs; explicit; operations; primitive
                 types; structures; templates; typing constraints; user;
                 value-oriented storage model",
  treatment =    "P Practical",
}

@Article{Huon:1981:NPA,
  author =       "Simon Huon and Robert Smith",
  title =        "Network Problem-Determination Aids in
                 Microprocessor-Based Modems",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "3--16",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper develops the rationale and design
                 considerations underlying the definition and
                 implementation of the modem network management
                 functions that are required for integrating the link
                 subsystem into a centralized network management system
                 suitable for user networks conforming to IBM's Systems
                 Network Architecture.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1250 (Modulators, demodulators, discriminators and
                 mixers); B6210L (Computer communications); C5600 (Data
                 communication equipment and techniques); C7410F
                 (Communications computing)",
  classification = "703; 721",
  corpsource =   "IBM Lab., CER, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3705; ACF/NCP/VS control program; communication
                 networks; communications computer control; computer
                 networks; computers, microprocessor; digital signal
                 processing techniques; electric networks,
                 communication; IBM data modems; implementation
                 decisions; LSI; microprocessor-based modems; modems;
                 network problem determination aids; System/370 NPDA
                 program product",
  treatment =    "P Practical",
}

@Article{Godard:1981:MM,
  author =       "Dominique Godard and Daniel Pilost",
  title =        "A 2400-bit/s microprocessor-based modem",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "17--24",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the main characteristics of a new
                 microprocessor-implemented 2400-bit/s data modem, the
                 IBM 3863. In addition to the execution of signal
                 processing tasks, the microprocessor provides a variety
                 of other significant functions such as diagnostics and
                 aids in network problem determination.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1250 (Modulators, demodulators, discriminators and
                 mixers); B6210L (Computer communications); C5600 (Data
                 communication equipment and techniques); C7410F
                 (Communications computing)",
  classification = "703; 721",
  corpsource =   "IBM Lab., CER, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2400; adaptive equalization; bit/s
                 microprocessor-based data modem; carrier recovery;
                 communications computer control; computer networks;
                 computerised signal processing; computers,
                 microprocessor; determination; diagnostics; electric
                 networks, communication; hardware multiplication
                 capability; IBM 3863; modems; network problem; phase
                 control; signal processing; timing",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Gruodis:1981:CLT,
  author =       "A. J. Gruodis and C. S. Chang",
  title =        "Coupled Lossy Transmission Line Characterization and
                 Simulation",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "25--41",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It has been shown that the frequency domain solution
                 of the coupled lossy transmission line differential
                 equations has a similar appearance to that of the
                 single line. The frequency-dependent n multiplied by n
                 characteristic admittance matrix Y$_0$ and propagation
                 matrix GAMMA can be obtained from network analyzer
                 insertion loss data treating the coupled transmission
                 lines as a 2n-port network. This paper develops a
                 transient simulation technique for coupled lossy
                 transmission lines based on frequency-dependent Y$_0$
                 and GAMMA data. Simulation results agree very well with
                 transient measurements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5240 (Transmission line theory); C7410F
                 (Communications computing)",
  classification = "703",
  corpsource =   "IBM Data Systems Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "admittance matrix; communication transmission lines;
                 computer aided analysis; coupled lossy transmission
                 line; electric networks; frequency domain solution;
                 frequency-domain analysis; insertion loss data; matrix
                 algebra; network analyzer; propagation matrix; theory;
                 transient measurement; transient simulation technique;
                 transmission line",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Diaz:1981:PNO,
  author =       "A. Diaz and J. M. {Vasquez Vallejo} and A. {Martinez
                 Duran}",
  title =        "(Pt)polypyrrole: a new organic electrode material",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "42--50",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8245 (Electrochemistry and electrophoresis)",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(Pt/polypyrrole); BF/sub 4/-doped polypyrrole;
                 electrochemical electrodes; Lewis bases; nucleophiles;
                 organic electrode material; polymer films; redox
                 reactions",
  treatment =    "N New Development; X Experimental",
}

@Article{Street:1981:CPR,
  author =       "G. B. Street and T. C. Clarke",
  title =        "Conducting Polymers: a Review of Recent Work",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "51--57",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The conductivities of all the currently reported
                 conducting polymers are compared to those of the
                 classical metals. The requirements for a
                 technologically useful conducting polymer are
                 considered and the degree to which existing conducting
                 polymers meet these requirements is evaluated. The
                 mechanism of doping is discussed together with the
                 final state of the dopant and the polymer. The
                 available structural data are described as well as the
                 problems of structurally characterizing these systems.
                 Some of the problems of inhomogeneous distribution of
                 dopant species are also pointed out.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators)",
  classification = "815",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "conducting polymers; doping; inhomogeneous
                 distribution; polymers; review; reviews; structural
                 data",
  treatment =    "G General Review",
}

@Article{Krakow:1981:CSH,
  author =       "William Krakow",
  title =        "Computer Simulation of High-Resolution Electron
                 Micrographs Using Dynamical Electron Scattering",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "58--70",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A system of computer programs has been implemented
                 that calculates both high-resolution images and
                 diffraction patterns of generalized objects for the
                 conventional transmission electron microscope.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650M (Computing devices and techniques); A0780
                 (Electron and ion microscopes and techniques); C7320
                 (Physics and chemistry computing)",
  classification = "422; 423; 723; 741",
  corpsource =   "IBM Tomas J. Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(111) Crowdion; amorphous Fe film model; Au crystals;
                 Bragg; computer programs; computerised instrumentation;
                 computerised picture; diffraction patterns; diffuse
                 scattering; digital simulation; dynamical electron
                 scattering; electron micrographs; high resolution;
                 images; interstitial; microscopes, electron;
                 microscopy; processing; reflections; transmission
                 electron; transmission electron microscope; W",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Pan:1981:TRU,
  author =       "Kelly M. Pan and C. N. Liu",
  title =        "Tomographic Reconstruction of Ultrasonic Attenuation
                 with Correction for Refractive Errors",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "71--82",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The nonionizing and noninvasive characteristics of
                 ultrasonics promote its increasing use in medical
                 applications. Computerized ultrasonic attenuation
                 tomography is one area where medically significant
                 images may be reconstructed for diagnostic purposes.
                 The objective of this work is to make an initial
                 correction for refraction error and other problems
                 present in computerized ultrasonic tomography.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8760B (Sonic and ultrasonic radiation (medical
                 uses)); A8770E (Patient diagnostic methods and
                 instrumentation); C7330 (Biology and medical
                 computing)",
  classification = "461; 753",
  corpsource =   "Harvard Business School., Boston, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; biomedical engineering; biomedical
                 ultrasonics; computerised; computerised tomography;
                 medical applications; noninvasive characteristics;
                 nonionising characteristics; reconstruction; refraction
                 error; scanning technique; ultrasonic attenuation
                 tomography",
  treatment =    "X Experimental",
}

@Article{Bongiovanni:1981:NRC,
  author =       "G. Bongiovanni and C. K. Wong",
  title =        "A number representation convertor for magnetic bubble
                 string comparators",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "1",
  pages =        "83--87",
  month =        jan,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120L (Magnetic bubble domain devices); C5230
                 (Digital arithmetic methods); C5320E (Storage on
                 stationary magnetic media)",
  corpsource =   "Univ. di Pisa, Pisa, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1's-complement; 2's-; B1's-complement; comparators;
                 complement; convertors; digital arithmetic; magnetic
                 bubble devices; magnetic bubble string; negative
                 numbers; number representation convertor; sign bit;
                 signed-magnitude",
  treatment =    "P Practical",
}

@Article{Logue:1981:TIE,
  author =       "Joseph C. Logue and Walter J. Kleinfelder and Paul
                 Lowy and J. Randal Moulic and Wei Wha Wu",
  title =        "Techniques for Improving Engineering Productivity of
                 {VLSI} Designs",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "107--115",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The ability of the semiconductor industry to produce
                 chips with higher and higher circuit densities has
                 created a challenge for the product designer: to
                 utilize this capacity and still develop chips rapidly
                 at reasonable cost. A multi-faceted approach to VLSI
                 design is described that significantly reduces product
                 development time and resource from those required with
                 existing methods. This approach is based on the use of
                 PLA structures or macros. It consists of a
                 hardware\slash software modeling technique, use of
                 laser-personalizable PLAs for rapid modeling of PLA
                 macros, and a method for repairing design errors (that
                 may hide other errors) on the actual VLSI wafers with a
                 laser tool. A two-pass VLSI design is therefore highly
                 probable.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B1265B (Logic
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "713",
  corpsource =   "IBM System Communications Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "design engineering; errors; hardware/software
                 modelling technique; improving engineering
                 productivity; integrated circuits; integrated logic
                 circuits; integration; large scale; laser
                 personalizable PLAs; macros; method for repairing
                 design; multi-faceted approach; PLA; reduces product
                 development time; structures; VLSI design",
  treatment =    "A Application; P Practical",
  xxauthor =     "J. C. Logue and W. J. Kleinfelder and P. Lowy and J.
                 R. Moulic and Wha Wu Wei",
  xxnote =       "Check authors??",
}

@Article{Dansky:1981:BCD,
  author =       "Allan H. Dansky",
  title =        "Bipolar Circuit Design for a 5000-Circuit {VLSI} Gate
                 Array",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "116--125",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the design of a bipolar gate
                 array for a 5000-circuit microprocessor. The physical
                 design data obtained after completion of automatic
                 placement and wiring are presented. The distribution of
                 projected circuit delay for the 4437 nets is then
                 calculated and this information is used to determine
                 the selective increase in circuit power to reduce wide
                 spreads in turn-off and turn-on delays. It is shown
                 that this technique improves power\slash performance
                 and has implications for future VLSI designs.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180F (Electron and positron effects); A7155F
                 (Impurity and defect levels in tetrahedrally bonded
                 nonmetals); A7320H (Surface impurity and defect levels;
                 energy levels of adsorbed species); A7340Q
                 (Metal-insulator-semiconductor structures); B2530F
                 (Metal-insulator-semiconductor structures); B2550
                 (Semiconductor device technology)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "5000-circuit VLSI gate array; array; bipolar gate;
                 bipolar IC design; bipolar integrated circuits;
                 capacitance drive capability; cell; circuit layout CAD;
                 computers, microprocessor; distribution of; gate-array
                 chip circuit; integrated circuits; integration; large
                 scale; layout; logic; logic circuits; logic design;
                 microprocessor; microprocessor chips; physical design
                 data; power dissipation; projected circuit delay;
                 transistor-transistor; TTL",
  treatment =    "A Application; G General Review",
}

@Article{Dorler:1981:ERA,
  author =       "Jack Arthur Dorler and Joseph M. Mosley and Glenn A.
                 Ritter and Richard O. Seeger and James R. Struk",
  title =        "A 1024-byte {ECL} random access memory using a
                 complementary transistor switch ({CTS}) cell",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "126--134",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents the design of a 1K-byte random
                 access memory using a cross-coupled complementary
                 transistor switch (CTS) cell. The memory operates with
                 a 4.25-V power supply and achieves a 15-ns access time
                 with a power dissipation of 1.8 w. This paper also
                 demonstrates the advantages of using the CTS cell to
                 achieve high circuit density and good performance of
                 memory arrays. Array attributes, cell selection
                 criteria, and cell operation (both ideal and in situ)
                 as well as design considerations are covered. Hardware
                 performance is also briefly summarized.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B1265D (Memory circuits);
                 B2570B (Bipolar integrated circuits); C5320G
                 (Semiconductor storage)",
  classification = "714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1 K byte RAM; 15-ns access time; 4.25-V power supply;
                 access storage; array attributes; bipolar integrated
                 circuits; cell; cell selection criteria; cross coupled
                 complementary transistor switch; CTS; data storage,
                 semiconductor; density; design considerations; ECL;
                 emitter-coupled logic; high circuit; integrated memory
                 circuits; large scale integration; logic circuits;
                 memory arrays; operation; performance; power
                 dissipation 1.8 W; random-; VLSI",
  treatment =    "G General Review; X Experimental",
}

@Article{Berndlmaier:1981:DRC,
  author =       "Erich Berndlmaier and Jack Arthur Dorler and Joseph M.
                 Mosley and Stephen D. Weitzel",
  title =        "Delay Regulation --- a Circuit Solution to the
                 Power\slash Performance Tradeoff",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "135--141",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper introduces the concept of delay regulation
                 as a means of controlling circuit delay variations from
                 chip to chip, which is especially important in VLSI
                 products. An embodiment of this concept which applies a
                 phase-locked loop to individually control chip
                 performance and power is presented together with
                 computer-simulated results of an example design. It is
                 shown that accurate delay equations and the potential
                 for improved product yield result from application of
                 the concept. The circuit overhead for large circuits is
                 shown to be negligible. Application to a wide range of
                 logic circuit types is also described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265 (Digital electronics); B2570 (Semiconductor
                 integrated circuits); C5120 (Logic and switching
                 circuits)",
  classification = "713; 714",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accurate delay; chip to chip delay; circuit solution;
                 computer simulated results; concept of; controlling
                 circuit delay variations; delay regulation; digital
                 ICs; digital integrated circuits; electronic circuits,
                 delay type; equations; improved product yield;
                 individually control chip; integrated circuit
                 technology; integrated circuits; large scale
                 integration; performance; phase locked loop;
                 power/performance tradeoff; variations; VLSI",
  treatment =    "A Application; N New Development",
}

@Article{Chen:1981:HDB,
  author =       "Joseph Z. Chen and William Chin and Teh Sen Jen and
                 Joseph {Hutt, Jr.}",
  title =        "A high density bipolar logic masterslice for small
                 systems",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "142--151",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new high-density bipolar logic masterslice which
                 uses a simple Schottky Transistor Logic (STL) circuit
                 cell as its basic building block is presented in this
                 paper. The STL cell is derived from Integrated
                 Injection Logic (I**2L). The use of low-barrier
                 Schottky diodes for and logic, as diodes function in
                 Diode Transistor Logic (DTL), makes possible achieving
                 the NAND circuit operation. A brief description of the
                 Schottky diode fabrication process is also given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2560H (Junction and barrier
                 diodes)B2570B (Bipolar integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1.7-V power supply; bipolar integrated circuits;
                 contact hole personalization; delay 3 ns at 0.5 mW;
                 diode fabrication process; features; high cell density;
                 high density bipolar logic masterslice; I/O controller
                 chip; I/sup 2/L; integrated circuit technology;
                 integrated injection logic; integrated logic circuits;
                 large; Logic; logic circuits, diode transistor; low
                 barrier Schottky diodes; masterslice; propagation;
                 scale integration; Schottky; Schottky Transistor;
                 Schottky-barrier diodes; STL; structure; TTL compatible
                 I/O circuits; unique",
  treatment =    "N New Development; X Experimental",
}

@Article{Donath:1981:WLD,
  author =       "Wilm E. Donath",
  title =        "Wire Length Distribution for Placements of Computer
                 Logic",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "152--155",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is shown from simple theoretical considerations
                 that the distribution f$_k$ of wire lengths for a good
                 two-dimensional placement on a square. Manhattan grid
                 should be of the form f$_k$ equals g/k** gamma (1 less
                 than equivalent to k less than equivalent to L) and
                 f$_k$ approximately equals 0(k greater than L), where
                 gamma is related to the Rent partitioning exponent p by
                 the equation 2p plus gamma approximately equals 3.
                 Three placements were investigated and the distribution
                 functions for wire length were found to follow the
                 above relationships.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570 (Semiconductor integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "distribution of wire lengths; good two dimensional;
                 large scale integration; layout design; logic circuits;
                 placement; square Manhattan grid; theoretical
                 considerations; VLSI; wiring",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Ling:1981:HSB,
  author =       "Huey Ling",
  title =        "High-speed binary adder",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "156--166",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5120 (Logic and switching circuits)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adders; fewer logic levels; high; neighbouring bit;
                 new carry propagation; new scheme; pairs; reduced
                 component count; speed binary adder; uniform fanin
                 loading; uniform fanout loading",
  treatment =    "N New Development",
}

@Article{Shatzkes:1981:SB,
  author =       "M. Shatzkes and M. Av-Ron",
  title =        "Statistics of breakdown",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "167--175",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265 (Digital electronics); B2570 (Semiconductor
                 integrated circuits); C5120 (Logic and switching
                 circuits)",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "breakdown; devices screening; distributions; electric
                 breakdown; electronic; life testing; life tests;
                 metal-insulator-; ordering of defect; production
                 testing; ramp tests; screening procedures;
                 semiconductor; semiconductor structures; technology;
                 thin insulating layers in MOS devices; types",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Paivanas:1981:AFC,
  author =       "J. A. Paivanas and J. K. Hassan",
  title =        "Attraction force characteristics engendered by
                 bounded, radially diverging air flow",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "176--186",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4715C (Laminar boundary layers)",
  corpsource =   "IBM General Technol. Div. Lab., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air film wafer handling; attraction force;
                 axisymmetric circular; bound; characteristics; disk
                 model; equation; experiments; flow Reynolds number;
                 free disk weight; general energy; inertial forces;
                 laminar flow; laminar, incompressible flow analysis;
                 materials handling; momentum balance condition; one
                 dimensional approach; passage flow friction factor;
                 radially diverging air flow; resultant reaction fluid
                 force",
  treatment =    "A Application; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Yhap:1981:OCC,
  author =       "Ernesto F. Yhap and Evon C. Greanias",
  title =        "An on-line {Chinese} character recognition system",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "187--195",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an experimental system for the
                 on-line recognition of handwritten Chinese characters.
                 Constituent shapes of the characters are recognized as
                 they are formed on an electronic tablet. The 72
                 constituent shapes can define a very large set of
                 Chinese characters. The implementation described
                 recognizes more than 2200 Chinese characters. More
                 symbols can be added with relative ease. Experimental
                 results are given for two writer populations.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2200 Chinese; 72 constituent shapes; character
                 recognition; character recognition equipment;
                 characters recognition; Chinese character recognition
                 system; electronic tablet; experimental system;
                 handwritten Chinese characters; online recognition",
  treatment =    "X Experimental",
}

@Article{Vinal:1981:MSU,
  author =       "Albert W. Vinal",
  title =        "A magnetic sensor utilizing an avalanching
                 semiconductor device",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "2/3",
  pages =        "196--201",
  month =        may # "\slash " # jun,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new semiconductor device for sensing uniaxial
                 magnetic fields has been realized. The device is
                 basically a dual-collector open-base lateral bipolar
                 transistor operating in the avalanche region, and is
                 referred to as a Magnetic Avalanche Transistor. It
                 exhibits high magnetic transduction sensitivity
                 compared to traditional Hall-effect and conventional
                 nonlinear magnetoresistive devices.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630L (Measurement of basic electric and magnetic
                 variables)A0670D (Sensing and detecting devices);
                 A0670M (Transducers); A0755 (Magnetic instruments and
                 techniques); B2560J (Bipolar transistors); B7230
                 (Sensing devices and transducers); B7310L (Magnetic
                 variables measurement)",
  classification = "714",
  corpsource =   "IBM System Communication Div. Lab., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2/; avalanche region operation; Avalanche Transistor;
                 avalanching semiconductor device; bandwidth>5 MHz;
                 basic structure; bipolar transistors; characteristics;
                 collector open base lateral bipolar transistor; dual;
                 fabrication; high magnetic transduction; Magnetic;
                 magnetic field measurement; magnetic sensor; MAT; new;
                 ratio 20000/T; S/N; semiconductor device; semiconductor
                 devices; sensing uniaxial magnetic fields; sensitive
                 area 5 micron/sup; sensitivity; sensitivity 30V/T;
                 sensors; transducers",
  treatment =    "N New Development; X Experimental",
}

@Article{Buturla:1981:FAS,
  author =       "E. M. Buturla and P. E. Cottrell and B. M. Grossman
                 and K. A. Salsburg",
  title =        "Finite-Element Analysis of Semiconductor Devices: the
                 {FIELDAY} Program",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "218--231",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The FIELDAY program simulates semiconductor devices of
                 arbitrary shape in one, two, or three dimensions
                 operating under transient or steady-state conditions. A
                 wide variety of physical effects, important in bipolar
                 and field-effect transistors, can be modeled. The
                 finite-element method transforms the continuum
                 description of mobile carrier transport in a
                 semiconductor device to a simulation model at a
                 discrete number of points. Coupled and decoupled
                 algorithms offer two methods of linearizing the
                 differential equations. Direct techniques are used to
                 solve the resulting matrix equations. Pre-and
                 post-processors enable users to rapidly generate new
                 models and analyze results. Specific examples
                 illustrate the flexibility and accuracy of FIELDAY.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2560B (Semiconductor device modelling and equivalent
                 circuits); C7410D (Electronic engineering computing)",
  classification = "714; 921",
  corpsource =   "IBM General Technol. Div. Lab., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar; circuit CAD; digital simulation;
                 field-effect; FIELDAY program; finite element analysis;
                 finite-element method; mathematical models; mobile
                 carrier; semiconductor device models; semiconductor
                 devices; simulation model; steady-state conditions;
                 transient conditions; transistors; transport",
  treatment =    "A Application; P Practical",
}

@Article{Hachtel:1981:SAUa,
  author =       "G. D. Hachtel and M. H. Mack and R. R. O'Brien and B.
                 Speelpenning",
  title =        "Semiconductor analysis using finite elements. {I}.
                 {Computational} aspects",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "232--245",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "SAFE is a general-purpose program for finite-element
                 analysis of systems of nonlinear, nonvariational PDE.
                 The form and nonlinearity of the PDE, as well as the
                 domain, parameters, and boundary conditions of the
                 problem, are user-specified. A method is given for
                 unified treatment of nonstandard finite elements such
                 as bicubic-spline and ``current-continuous''
                 elements.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); C7410D (Electronic engineering computing)",
  classification = "714; 921",
  corpsource =   "IBM Thomas J.Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bicubic-spline; current continuous elements;
                 equations; finite element analysis; finite-element
                 analysis; general-purpose program; mathematical models;
                 partial differential; partial differential equations;
                 SAFE; semiconductor device models; semiconductor
                 devices; sparse-matrix methods",
  treatment =    "A Application; P Practical",
}

@Article{Hachtel:1981:SAUb,
  author =       "G. D. Hachtel and M. H. Mack and R. R. O'Brien",
  title =        "Semiconductor analysis using finite elements. {II}.
                 {IGFET} and {BJT} case studies",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "246--260",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Semiconductor-like Applications of Finite Elements
                 (SAFE), a novel, nonlinear, general-purpose
                 two-dimensional finite-element code, is applied to
                 problems in device modeling. Case studies of
                 contemporary insulated gate field effect transistor
                 (IGFET) and bipolar junction transistor (BJT)
                 structures are given which demonstrate the reliability,
                 versatility, and efficiency of finite-element methods
                 in general and of the SAFE program in particular. The
                 user-defined SAFE physical model is compared with
                 experiments on a doubly implanted short-channel IGFET.
                 Computer experiments are performed, indicating how to
                 select the type, distribution, and
                 numerical-integration method of finite elements for
                 maximally efficient, assured-convergence,
                 engineering-accuracy analysis, either steady state or
                 transient.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors); B2560R
                 (Insulated gate field effect transistors); C7410D
                 (Electronic engineering computing)",
  classification = "714; 921",
  corpsource =   "IBM Thomas J.Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; bipolar junction; bipolar transistors;
                 digital simulation; engineering-accuracy analysis;
                 finite element; general-purpose two-dimensional
                 finite-element code; insulated gate field effect
                 transistor; insulated gate field effect transistors;
                 mathematical models; SAFE program; semiconductor device
                 models; semiconductor devices; steady-state analysis;
                 transient analysis; transistor",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical",
}

@Article{Lee:1981:NVC,
  author =       "D. T. Lee and S. J. Hong and C. K. Wong",
  title =        "Number of Vias: a Control Parameter for Global Wiring
                 of High-Density Chips",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "261--271",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In integrated circuits, components are frequently
                 interconnected by horizontal and vertical wires in
                 respective wiring planes whether on chip, card, or
                 board. The wire changes direction through ``vias'' that
                 connect the orthogonal wiring planes. Because of
                 technology constraints, the arrangement of vias must
                 conform with certain neighborhood restrictions. We
                 present results on the guaranteed minimum number and
                 maximum possible number of vias in a given wiring cell
                 for various technology constraints. These numbers
                 provide an early means of control on global wiring
                 routes to further the success of the exact embedding
                 process that follows global wiring.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2240 (Microassembly techniques); B2570 (Semiconductor
                 integrated circuits)",
  classification = "713",
  corpsource =   "Northwestern Univ., Evanston, IL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "control parameter; embedding process; global wiring;
                 high-density chips; integrated circuit technology;
                 integrated circuits; large scale integration; LSI;
                 microassembling; vias; wiring planes",
  treatment =    "A Application; P Practical",
}

@Article{Darringer:1981:LST,
  author =       "John A. Darringer and William H. {Joyner, Jr.} and C.
                 Leonard Berman and Louise Trevillyan",
  title =        "Logic Synthesis Through Local Transformations",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "272--280",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an experimental system for
                 synthesizing synchronous combinational logic. It allows
                 a designer to start with a naive implementation
                 produced automatically from a functional specification,
                 evaluate it with respect to these many factors, and
                 incrementally improve this implementation by applying
                 local transformations until it is acceptable for
                 manufacture. The use of simple local transformations in
                 the system ensures correct implementations, isolates
                 technology-specific data, and will allow the total
                 process to be applied to larger, VLSI designs.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5120 (Logic and switching
                 circuits); C5210B (Computer-aided logic design); C7410D
                 (Electronic engineering computing)",
  classification = "721",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chip implementations; combinatorial circuits; design;
                 integrated logic circuits; large; local; logic; logic
                 CAD; logic design; masterslice chip; scale integration;
                 synchronous combinational logic; transformations; VLSI
                 designs",
  treatment =    "P Practical",
}

@Article{Fitzgerald:1981:GIG,
  author =       "William Fitzgerald and Franklin Gracer and Robert
                 Wolfe",
  title =        "{GRIN}: interactive graphics for modeling solids",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "281--294",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an experimental system for the
                 original generation and subsequent modification of
                 volume models of complex physical objects, using
                 interactive computer graphics. The models are built up
                 from primitive volumes, e.g., cuboids, cylinders, swept
                 surfaces, etc., entered by a mechanical engineer
                 interacting with a two dimensional projection of the
                 model on a graphic display screen. The primitives may
                 be entered at any orientation in 3-space and combined
                 to form a single polyhedral model. The central issue is
                 the provision of an efficient, natural means for
                 generating these models.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5540 (Terminals and graphic displays); C7440 (Civil
                 and mechanical engineering computing)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; complex physical objects; computer aided design;
                 computer graphics; engineering computing; GRIN;
                 interactive; interactive systems; mechanical;
                 mechanical engineer; projection; two dimensional;
                 volume models",
  treatment =    "A Application; P Practical",
}

@Article{Ju:1981:PMM,
  author =       "K. Ju and H. L. Hu and R. G. Hirko and E. B. Moore and
                 D. Y. Saiki and R. O. Schwenker",
  title =        "Propagation of $1-\mu m$ Bubbles in Contiguous Disk
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "295--302",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Propagation margins of contiguous disk devices
                 fabricated on both single-and double-layer garnet films
                 have been measured. These performance measurements for
                 1-$\mu$m diameter magnetic bubble propagation were made
                 on devices with cell sizes of 18 and 30 $\mu$ m**2. The
                 dependence of bias margin on ion-implantation
                 conditions, material parameters, propagation pattern
                 geometries, and temperature is discussed. Deuterium
                 implantation is introduced, together with a new
                 propagation pattern.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120L (Magnetic bubble domain devices)",
  classification = "721; 722",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bias margin; cell sizes; conditions; contiguous disk
                 devices; data storage, magnetic; garnet films; garnets;
                 ion-implantation; magnetic bubble; magnetic bubble
                 devices; propagation; propagation pattern geometries",
  treatment =    "P Practical; X Experimental",
}

@Article{Kaufman:1981:PIP,
  author =       "Frank B. Kaufman",
  title =        "{Pi-Donor} Intercalate Polymers: Synthesis,
                 Charge-Transfer Interactions, and Applications",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "303--314",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The purpose of this article is to describe a
                 relatively new class of organic solids, pi-donor
                 polymers, which may offer a rather high degree of
                 desirable synthetic variability. The preparation of
                 these materials, their unusual electrochemical and
                 conduction properties in thin-film form, and possible
                 applications are discussed. In addition, their
                 properties are compared and contrasted with related
                 organic and inorganic solid state materials.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7215N (Collective modes; low-dimensional
                 conductors)",
  classification = "815",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "anion; charge-compensating; charge-transfer
                 interactions; chemical oxidation; electrochemical
                 treatment; electronic interactions; films;
                 intercalation compounds; irradiation;
                 low-ionization-potential; one-dimensional conductivity;
                 organic donor molecules; pi-donor intercalate polymer;
                 polymers; synthesis",
  treatment =    "X Experimental",
}

@Article{Clementi:1981:CSC,
  author =       "Enrico Clementi",
  title =        "Computer Simulations of Complex Chemical Systems:
                 Solvation of {DNA} and Solvent Effects in
                 Conformational Transitions",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "315--326",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A very detailed representation is now available
                 concerning the structure and interaction energy of
                 water molecules in the first solvation shell or in the
                 ``grooves'' of the DNA. The data obtained by computer
                 simulation are in good agreement with indirect data
                 from DNA fibers at different relative humidities and
                 with other indirect evidence. In addition, simulated
                 results allow for a preliminary model for the solvent
                 effects in transition processes between different DNA
                 conformations. The model presented is also in agreement
                 with available experimental data. Finally, results
                 report the first determination of the position of
                 counterions in DNA at different relative humidities and
                 at room temperature. This application demonstrates the
                 flexibility of the computational approach.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3620C (Macromolecular conformation (statistics and
                 dynamics)); A3620H (Macromolecular configuration
                 (bonds, dimensions)); C7320 (Physics and chemistry
                 computing)",
  classification = "461; 723",
  corpsource =   "IBM Data Processing Product Group Lab., Poughkeepsie,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "biochemical engineering; complex chemical systems;
                 computer simulation; conformational transitions;
                 counterions; digital simulation; DNA; dynamics;
                 macromolecular; macromolecular configurations;
                 macromolecular dynamics; physics computing; solvation;
                 solvent effects",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Kozen:1981:PFL,
  author =       "Dexter Kozen",
  title =        "Positive First-Order Logic is {NP-Complete}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "4",
  pages =        "327--332",
  month =        jul,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "03D15 (03B25)",
  MRnumber =     "83b:03050",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The decision problem for positive first-order logic
                 with equality is NP-complete. More generally, if SIGMA
                 is a finite set of atomic sentences (i.e., atomic
                 formulas of the form $t_1$ equals $t_2$ or $Rt_1
                 \ldots{} t_n$ containing no variables) and negations of
                 atomic sentences and if PHI is a positive first-order
                 sentence, then the problem of determining whether phi
                 is true in all models of SIGMA is NP-complete.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic)",
  classification = "922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atomic sentences; decision problem; decision theory
                 and analysis; formal logic; NP-complete; positive
                 first-order logic",
  reviewer =     "Egon B{\"o}rger",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kozen:1981:PFO,
  author =       "Dexter Kozen",
  title =        "Positive first-order logic is {NP}-complete",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "??",
  pages =        "327--332",
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "481.03026",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bashe:1981:AIE,
  author =       "C. J. Bashe and W. Buchholz and G. V. Hawkins and J.
                 J. Ingram and N. Rochester",
  title =        "The Architecture of {IBM}'s Early Computers",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "363--375",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Most of the early computers made by IBM for commercial
                 production are briefly described with an emphasis on
                 architecture and performance. The description covers a
                 period of fifteen years, starting with the design of an
                 experimental machine in 1949 and extending to, but not
                 including, the announcement in 1964 of System\slash
                 360.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture; computer architecture; computers ---
                 Reviews; IBM computers; performance; review; reviews;
                 System/360",
  treatment =    "G General Review",
}

@Article{Padegs:1981:SB,
  author =       "A. Padegs",
  title =        "{System\slash 360} and Beyond",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "377--390",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The evolution of modern large-scale computer
                 architecture within IBM is described, starting with the
                 announcement of System\slash 360 in 1964 and covering
                 the latest extensions to System\slash 370. Emphasis is
                 placed on key attributes and on the motivation for
                 providing them, and an assessment is made of the
                 experience gained in the implementation and use of the
                 architecture. The main approaches are discussed for
                 obtaining implementations at widely differing
                 performance levels, and a number of significant
                 implementation parameters for all processors are
                 listed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture)",
  classification = "722; 723",
  corpsource =   "Poughkeepsie Lab., IBM Data Processing Products,
                 Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; IBM computers; large scale
                 computer architecture; processors; review; reviews;
                 System/360",
  treatment =    "G General Review",
}

@Article{Jarema:1981:IDC,
  author =       "David R. Jarema and Edward W. Sussenguth",
  title =        "{IBM} Data Communications: a Quarter Century of
                 Evolution and Progress",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "391--404",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the evolution of technological
                 development in data communications at IBM. Rather than
                 attempting to present a complete history, it emphasizes
                 the changing environment and describes the more
                 significant innovations that were incorporated in IBM's
                 line of data communications products. Evolutionary
                 developments in this area are traced from
                 point-to-point batch transmission, to on-line batch
                 communications, to interactive systems, and finally to
                 networking. Although several aspects are treated, the
                 primary focus of this account is on systems
                 architecture, applications, and technology.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5600 (Data communication equipment and techniques)",
  classification = "722; 723",
  corpsource =   "IBM System Communication Div. Lab., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; data communication systems;
                 data communications; data processing; development;
                 evolution; IBM data communications; interactive;
                 networking; on line batch communications; point to
                 point batch; reviews; systems; systems architecture;
                 technological; transmission",
  treatment =    "G General Review",
}

@Article{Olsen:1981:RSF,
  author =       "P. F. Olsen and R. J. Orrange",
  title =        "Real-Time Systems for {Federal} Applications: a Review
                 of Significant Technological Developments",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "405--416",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Federal Systems Division of IBM has been heavily
                 involved in complex, on-line, real-time systems for
                 over twenty-five years. In this paper a representative
                 sample of these programs are reviewed, and an
                 evaluation of the significant lessons learned from this
                 wealth of experience is presented. The key issues which
                 differentiate real-time systems from their more
                 conventional data processing counterparts are
                 identified and their implications are discussed. This
                 leads to some conclusions regarding the kind of
                 commitment that is necessary in order to succeed in the
                 area of real-time applications.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers); C7130 (Public
                 administration)",
  classification = "722",
  corpsource =   "IBM Federal Systems Div. Facility, Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems, digital; data processing;
                 evaluation; Federal; government data processing; IBM;
                 on line systems; real-time systems; review; reviews;
                 Systems Division; technological developments",
  treatment =    "A Application; G General Review",
}

@Article{James:1981:ERT,
  author =       "S. E. James",
  title =        "Evolution of Real-Time Computer Systems for Manned
                 Spaceflight",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "417--428",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A brief description of manned spaceflight programs,
                 their accomplishments, and IBM's involvement is
                 provided as background information. Emphasis is given
                 to the development of RTCC systems, as well as to the
                 technological and architectural changes affecting this
                 development. Also described were experiences gained in
                 the management of complex, real-time software systems
                 and the tools and techniques used in the development
                 process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B7650E (Space ground support centres); C3360L
                 (Aerospace control); C7420 (Control engineering
                 computing); C7460 (Aerospace engineering computing)",
  classification = "722; 723",
  corpsource =   "IBM Federal Systems Div. Facility, Houston, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aerospace computer control; aerospace computing;
                 architectural changes; computer architecture; computer
                 systems, digital; computers --- Aerospace Applications;
                 control systems; evolution; ground; ground based
                 command; NASA's manned spaceflight program; real time
                 computer systems; real-time systems; RTCC; software
                 systems; support systems; systems; tools",
  treatment =    "A Application; P Practical",
}

@Article{Taylor:1981:LGS,
  author =       "R. L. Taylor",
  title =        "Low-End General-Purpose Systems",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "429--440",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Since the announcement of the IBM System/3 in 1969,
                 IBM has been incorporating leading-edge technology in
                 products referred to as small general-purpose systems.
                 With the many models of the System/3, System\slash 32,
                 System\slash 34, and System\slash 38, IBM has
                 introduced many technological advances addressing the
                 needs of diverse customers, from the novice, first-time
                 user to the experienced user in the distributed data
                 processing account. By identifying the goals,
                 objectives, design themes, major salient features, and
                 development constraints, this paper reviews and
                 highlights the technical evolution of these products in
                 terms of their systems layout, processor architecture,
                 machine structure, and programming support.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "722; 723",
  corpsource =   "IBM Information Systems Div. Lab., Rochester, MN,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computers; design; distributed data; evolution;
                 general purpose computers; IBM System/3; low end
                 general purpose computer systems; machine structure;
                 processing; processor architecture; programming
                 support; reviews; salient features; System/32;
                 System/34; System/38; technical",
  treatment =    "G General Review",
}

@Article{Harrison:1981:ESR,
  author =       "Thomas J. Harrison and Bruce W. Landeck and Hal K.
                 {St. Clair}",
  title =        "Evolution of Small Real-Time {IBM} Computer Systems",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "441--452 (or 441--451??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper, the evolution of IBM small real-time
                 systems is traced from the late 1950s to the present.
                 Emphasis is placed on a few features and requirements
                 which characterize these systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "722; 723",
  corpsource =   "IBM Information Systems Div. Lab., Atlanta, GA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer systems, digital; data processing
                 applications; evolution; industrial processes; oil;
                 paper machines; real-time systems; refinery units;
                 requirements; review; reviews; small real-time IBM
                 computer systems; steel plants; time response",
  treatment =    "A Application; G General Review",
  xxauthor =     "T. J. Harrison and H. K. {St Clair} and B. W.
                 Landeck",
}

@Article{Hsiao:1981:RAS,
  author =       "M. Y. Hsiao and W. C. Carter and J. W. Thomas and W.
                 R. Stringfellow",
  title =        "Reliability, Availability, and Serviceability of {IBM}
                 Computer Systems: a Quarter Century of Progress",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "453--465",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "RAS developments have been driven primarily by
                 technological advances and by increases in functional
                 capability and complexity, but RAS considerations have
                 also played a leading role and have improved
                 technological and functional capability. The paper
                 briefly reviews the progress of computer technology. It
                 points out how IBM has maintained or improved its
                 systems RAS capabilities in the face of the greatly
                 increased number of components and system complexity by
                 improved system recovery and serviceability capability,
                 as well as by basic improvements in intrinsic component
                 failure rate. The paper also covers the CPU, tape, and
                 disk areas and shows how RAS improvements in these
                 areas have been significant. The main objective is to
                 provide a comprehensive view of significant
                 developments in the RAS characteristics of IBM computer
                 systems over the past twenty-five years.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "availability; computer operating systems; computer
                 testing; CPU; disk; IBM computer; performance; RAS;
                 reliability; review; reviews; serviceability; system
                 complexity; systems; tape",
  treatment =    "B Bibliography; G General Review",
}

@Article{Carter:1981:STS,
  author =       "S. P. Carter",
  title =        "Software technology. Section 2 in {25th Anniversary}
                 Issue",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "469--470",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:48:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; languages; performance",
  review =       "ACM CR 39750",
  subject =      "D Software, GENERAL \\ K.2 Computing Milieux, HISTORY
                 OF COMPUTING, Software",
}

@Article{Auslander:1981:EMO,
  author =       "M. A. Auslander and D. C. Larkin and A. L. Scherr",
  title =        "The evolution of the {MVS} operating system",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "471--482",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The mechanization of computer operations and the
                 extension of hardware functions are seen as the basic
                 purposes of an operating system. An operating system
                 must fulfill those purposes while providing stability
                 and continuity to its users. Starting with the data
                 processing environment of twenty-five years ago, this
                 paper describes the forces that led to the development
                 of the OS\slash 360 system design and then traces the
                 evolution which led to today's MVS system.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "722; 723",
  corpsource =   "IBM Corporate Headquarters, Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer operations; data
                 processing; environment; hardware functions; multiple
                 virtual storage; operating system; operating systems
                 (computers); OS/360 system design; reviews; virtual
                 storage",
  treatment =    "G General Review",
}

@Article{Creasy:1981:OVT,
  author =       "R. J. Creasy",
  title =        "The origin of the {VM\slash 370} time-sharing system",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "483--490",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "VM\slash 370 is an operating system which provides its
                 multiple users with seemingly separate and independent
                 IBM System\slash 370 computing systems. These virtual
                 machines are simulated using IBM System\slash 370
                 hardware and have its same architecture. In addition,
                 VM\slash 370 provides a single-user interactive system
                 for personal computing and a computer network system
                 for information interchange among interconnected
                 machines. VM\slash 370 evolved from an experimental
                 operating system designed and built over fifteen years
                 ago. This paper reviews the historical environment,
                 design influences, and goals which shaped the original
                 system.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "722; 723",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture; computer network; computer operating
                 systems; computer systems, digital; computing systems;
                 design; historical environment; IBM System/370;
                 interactive system; machines; operating system;
                 operating systems (computers); personal computing;
                 reviews; system; time-sharing systems; virtual; virtual
                 machines; VM/370 time-sharing system",
  treatment =    "G General Review",
}

@Article{Belady:1981:IHM,
  author =       "L. A. Belady and R. P. Parmelee and C. A. Scalzi",
  title =        "The {IBM} history of memory management technology",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "491--503",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This history of memory management technology in IBM
                 during the period between the 1950s and the early 70s
                 is discussed in this paper. The paper concentrates on
                 the programming and operating system aspects of the
                 problem, rather than the hardware technology
                 involved.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "723",
  corpsource =   "IBM Corporate Headquarters, Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer software; computer systems programming;
                 digital storage; management; memory management
                 technology; operating; operating systems (computers);
                 programming; review; storage; system",
  treatment =    "G General Review",
}

@Article{McGee:1981:DBT,
  author =       "W. C. McGee",
  title =        "Data Base Technology",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "505--519",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The evolution of data base technology over the past
                 twenty-five years is surveyed, and major IBM
                 contributions to this technology are identified and
                 briefly described.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6160 (Database management systems (DBMS))",
  classification = "723",
  corpsource =   "IBM Data Processing Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data base systems; data base technology; database
                 management systems; DBMS; review",
  treatment =    "B Bibliography; G General Review",
}

@Article{Sammet:1981:HIT,
  author =       "Jean E. Sammet",
  title =        "History of {IBM}'s Technical Contributions to High
                 Level Programming Languages",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "520--534",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Those IBM languages deemed to have made major
                 contributions are (in alphabetical order) APL, FORTRAN,
                 GPSS, and PL/I. Smaller contributions (because of
                 lesser general usage) have been made by Commercial
                 Translator, CPS, FOR-MAC, QUIKTRAN, and SCRATCHPAD.
                 Major contributions were made in the area of formal
                 definition of languages, through the introduction of
                 BNF (Backus-Naur Form) for defining language syntax and
                 VDL (Vienna Definition language) for semantics.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  classification = "723",
  corpsource =   "IBM Federal Systems Div. Headquarters, Bethesda, MD,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL; BNF; Commercial; computer programming languages;
                 CPS; FORMAC; FORTRAN; GPSS; high level; high level
                 languages; IBM's technical contributions; PL/I;
                 programming languages; QUIKTRAN; reviews; SCRATCHPAD;
                 Translator; VDL",
  treatment =    "B Bibliography; G General Review",
}

@Article{Allen:1981:HLP,
  author =       "F. E. Allen",
  title =        "The History of Language Processor Technology in
                 {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "535--548",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The history of language processor technology in IBM is
                 described in this paper. Most of the paper is devoted
                 to compiler technology; interpreters, assemblers, and
                 macro systems are discussed briefly. The emphasis is on
                 scientific contributions and technological advances
                 from a historical perspective. The synergistic
                 relationship between theory and practice is a
                 subtheme.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "assemblers; compiler technology; computer operating
                 systems; computer programming languages; history;
                 interpreters; language processor technology; macro
                 systems; program assemblers; program compilers; program
                 interpreters",
  treatment =    "B Bibliography; G General Review",
}

@Article{Lucas:1981:FSP,
  author =       "P. Lucas",
  title =        "Formal Semantics of Programming Languages: {VDL}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "549--561",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The history of ideas that led to the first
                 formalization of the syntax and semantics of PL/I is
                 sketched. The definition method and notation are known
                 as the Vienna Definition Language (VDL). The paper
                 examines the relationship between VDL and both
                 denotational semantics and the axiomatic approach to
                 programming language definition.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C6140D (High level languages)",
  classification = "723",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "axiomatic approach; computer programming languages;
                 definition; formal languages; high level languages;
                 history; Language; PL/I; programming language;
                 semantics; syntax; Vienna Definition",
  treatment =    "B Bibliography; G General Review",
}

@Article{Bard:1981:ICC,
  author =       "Yonathan Bard and Charles H. Sauer",
  title =        "{IBM} Contributions to Computer Performance Modeling",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "562--570",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Performance modeling can be used throughout the life
                 of a computer system, from initial design, through
                 implementation, configuration (and reconfiguration) and
                 even tuning. Performance models are usually solved by
                 numerical techniques, where possible, and by
                 simulation, otherwise. This paper summarizes IBM's
                 contributions to performance modeling and the solution
                 of performance models.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers); C7430 (Computer
                 engineering)",
  classification = "722; 723",
  corpsource =   "IBM Cambridge Sci. Center, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer performance
                 modeling; computer testing; numerical techniques",
  treatment =    "B Bibliography; G General Review",
}

@Article{Flatt:1981:CME,
  author =       "H. P. Flatt",
  title =        "Computer Modeling in Energy and the Environment",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "571--581 (or 571--580??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper the contributions of IBM scientists to
                 improve models in the fields of air pollution, solar
                 energy, plasma physics, coal gasification, and energy
                 conservation are summarized. These contributions
                 include not only better numerical and programming
                 techniques but improved mathematical models based upon
                 advances in understanding of the physical processes
                 involved.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7390 (Other natural sciences computing); C7410B
                 (Power engineering computing)",
  classification = "723; 901",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air pollution; coal gasification; computer modelling;
                 digital simulation; energy; energy resources; energy
                 resources --- Computer Applications; environment;
                 environmental impact; mathematical models; physical
                 processes; plasma physics; power; solar; solar energy",
  treatment =    "B Bibliography; G General Review",
}

@Article{Pugh:1981:SSM,
  author =       "E. W. Pugh and R. A. Henle and D. L. Critchlow and L.
                 A. Russell",
  title =        "Solid State Memory Development in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "585--602",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Processor memory technology evolved from cathode ray
                 storage tubes in the early 1950s, through ferrite cores
                 and thin magnetic films in the 1950s and 1960s, to
                 bipolar and MOSFET semiconductor memories in the late
                 1960s through the 1970s. This paper describes these
                 developments and the technical innovations that made
                 them possible. It also describes continuing exploratory
                 efforts, including work on magnetic bubbles --- the
                 newest solid state memory technology.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); C5320 (Digital storage)",
  classification = "714; 721; 722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar semiconductor; cathode ray storage tubes; data
                 storage, magnetic --- Bubbles; data storage,
                 semiconductor; digital storage; ferrite cores; films;
                 IBM processors; information processing equipment;
                 magnetic bubbles; memories; MOSFET semiconductor
                 memories; reviews; solid state memory development;
                 technical innovations; thin magnetic",
  treatment =    "B Bibliography; G General Review",
  xxauthor =     "E. W. Pugh and D. L. Critchlow and R. A. Henle and L.
                 A. Russell",
}

@Article{Rymaszewski:1981:SLT,
  author =       "E. J. Rymaszewski and J. L. Walsh and G. W. Leehan",
  title =        "Semiconductor Logic Technology in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "603--616",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the evolution of semiconductor
                 logic technology in IBM from its early replacement of
                 vacuum tubes in the mid-1950s to the beginnings of
                 VLSI. It highlights the major challenges and
                 accomplishments in the development of bipolar and
                 field-effect transistor technologies and their
                 embodiment in components for a wide spectrum of IBM
                 products.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits)",
  classification = "714; 721",
  corpsource =   "IBM General Technol. Div. Lab., East Fishkill
                 Facility, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar transistor technologies; field effect
                 transistor technologies; integrated circuit; integrated
                 circuit technology; integrated circuits; integrated
                 logic circuits; logic devices; review; reviews;
                 semiconductor devices; semiconductor logic technology;
                 technology; tubes; vacuum; VLSI",
  treatment =    "B Bibliography; G General Review",
}

@Article{Seraphim:1981:EPE,
  author =       "D. P. Seraphim and I. Feinberg",
  title =        "Electronic Packaging Evolution in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "617--630 (or 617--629??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reviews the development of packaging for
                 semiconductors since the 1950's with the IBM 1400
                 Series, and culminated in the IBM 4300 Series of
                 computers and the IBM 3081. The highlights of the
                 technical approaches which have been developed over the
                 twenty-five-year period are discussed briefly in this
                 paper.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging)",
  classification = "723",
  corpsource =   "IBM System Products Div. Lab., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electronics packaging; IBM 3081; IBM 4300 Series;
                 interconnections; joints; module; multilayers;
                 packaging; plated through holes; reviews; semiconductor
                 connections; solder; soldering; System/360",
  treatment =    "G General Review",
}

@Article{Case:1981:DAI,
  author =       "P. W. Case and M. Correia and W. Gianopulos and W. R.
                 Heller and H. Ofek and T. C. Raymond and R. L. Simek
                 and C. B. Stieglitz",
  title =        "Design Automation in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "631--646",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the significant steps in the
                 development of Design Automation technology in IBM, and
                 covers the design tools which support the design of the
                 electronic portion of such systems. The paper
                 emphasizes the systems approaches taken and the topics
                 of design verification, test generation, and physical
                 design. Descriptions of the technical contributions and
                 interactions which have led to the unique
                 characteristics of IBM's Design Automation systems are
                 included.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 C5420 (Mainframes and minicomputers); C7410D
                 (Electronic engineering computing)",
  classification = "723",
  corpsource =   "IBM System Communication Div. Lab., Kingston, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit CAD; computer aided design; design automation
                 technology; design tools; design verification; digital
                 systems; physical design; test generation",
  treatment =    "G General Review",
}

@Article{Harding:1981:SMI,
  author =       "William E. Harding",
  title =        "Semiconductor Manufacturing in {IBM}, 1957 to the
                 Present: a Perspective",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "647--658",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The past twenty-five years have witnessed the
                 transition from germanium-based, individual transistors
                 in their hermetically sealed enclosures to VLSI silicon
                 devices interconnected in modular packages containing
                 more than 50 000 logic circuits or as many as 500 000
                 bits of random-access memory. During this progression,
                 manufacturing facilities producing these modern
                 products have become more complex and technologically
                 more sophisticated than those of any other industry.
                 This review traces these fast-moving changes as they
                 have occurred in IBM, emphasizing the continuous
                 expansion of manufacturing skills and disciplines and
                 how these, in turn, have contributed to the development
                 of today's products and their respective manufacturing
                 systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2560 (Semiconductor devices); B2570 (Semiconductor
                 integrated circuits)",
  classification = "714",
  corpsource =   "IBM General Technol. Div. Lab., East Fishkill,
                 Facility, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuits; hermetically sealed enclosures; integrated
                 circuit technology; large scale integration; logic;
                 modular packages; RAM; reviews; semiconductor device
                 manufacture; semiconductor manufacturing; VLSI Si
                 devices",
  treatment =    "G General Review",
}

@Article{Stevens:1981:EMS,
  author =       "L. D. Stevens",
  title =        "The evolution of magnetic storage",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "663--675",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper gives a general review and historical
                 perspective of magnetic storage development within IBM
                 and is an introduction to the subsequent papers on
                 disk, diskette, and tape technology and on disk
                 manufacturing.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media)",
  classification = "721; 722",
  corpsource =   "IBM General Products Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "column magnetic tape transport; cost; data processing
                 systems; data storage, magnetic; magnetic; magnetic
                 disc and drum storage; magnetic drums; magnetic heads;
                 magnetic storage; magnetic tapes; movable head disk
                 drive; performance; reliability; review; reviews; tape
                 storage; vacuum",
  treatment =    "B Bibliography; G General Review",
}

@Article{Harker:1981:QCD,
  author =       "J. M. Harker and D. W. Brede and R. E. Pattison and G.
                 R. Santana and L. G. Taft",
  title =        "A quarter century of disk file innovation",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "677--690 (or 677--689??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper traces the development of disk file
                 technology from the first disk drive to the present. A
                 number of innovative advances are reviewed in the
                 evolution of mechanical design, materials, and
                 processes. These advances constitute the technological
                 base that has permitted almost four orders of magnitude
                 of improvement in areal density; they are discussed
                 from four interrelated aspects: the magnetic head and
                 its air bearing support; the head positioning actuator;
                 the disk substrate and its magnetic coating; and the
                 read\slash write signal detection and clocking
                 electronics.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C3260B (Electric
                 actuators and final control equipment); C5320C (Storage
                 on moving magnetic media); C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM General Products Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air bearing support; clocking electronics; data
                 storage, magnetic; density; design; disk drive; disk
                 file innovation; disk substrate; electric actuators;
                 electric drives; head; magnetic coating; magnetic disc
                 and drum; magnetic head; magnetic heads; mechanical;
                 positioning actuator; read/write signal detection;
                 reviews; storage",
  treatment =    "G General Review",
}

@Article{Harris:1981:IDM,
  author =       "J. P. Harris and W. B. Phillips and J. F. Wells and W.
                 D. Winger",
  title =        "Innovations in the Design of Magnetic Tape
                 Subsystems",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "691--699 (or 691--670??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper explores the selection of magnetic tape as
                 an input\slash output medium for electronic computers
                 and reviews the innovations in the development of
                 magnetic tape and tape handling machines since their
                 introduction in the early 1950s.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media); C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM General Products Div. Headquarters, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic; design; electronic computers;
                 input/output medium; magnetic; magnetic tape equipment;
                 magnetic tape storage; magnetic tape subsystems;
                 reviews; tape handling machines; tapes",
  treatment =    "G General Review",
}

@Article{Engh:1981:IDD,
  author =       "James T. Engh",
  title =        "The {IBM} diskette and diskette drive",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "701--710",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The diskette and diskette drive have had a major
                 influence on data processing. They provide a low-cost,
                 compact, high-performance solution to the need for a
                 reusable magnetic medium and have largely replaced the
                 punched card in many applications. Early applications
                 were simple program-load functions. Today these have
                 expanded to a wide range of medium exchange,
                 information storage, and data processing applications.
                 This paper examines the history of the development of
                 these products within IBM. The discussion includes some
                 of the alternatives considered and some of the problems
                 encountered during these developments.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM Information Systems Div. Lab., Rochester, MN,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data processing; data storage, magnetic; development;
                 diskette drive; electric drives; history; IBM diskette;
                 information storage; magnetic; magnetic disc and drum
                 storage; medium; reviews",
  treatment =    "G General Review",
}

@Article{Mulvany:1981:IDF,
  author =       "R. B. Mulvany and L. H. Thompson",
  title =        "Innovations in Disk File Manufacturing",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "711--723",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses the important innovations in disk
                 file manufacturing at IBM over the past twenty-five
                 years. Technology advances in the key components of
                 disk files --- the magnetic read\slash write head, its
                 air bearing support, and the disk substrate and
                 magnetic coating --- have permitted almost four orders
                 of magnitude increase in areal recording density since
                 the first disk file, the IBM 350, was shipped in 1957.
                 Manufacturing capability for these basic recording
                 technology components has been the key to realizing the
                 cost\slash performance promise of each new technology.
                 The evolution of this manufacturing capability is
                 discussed with an emphasis on important innovations in
                 processes, materials, tools, and testing techniques.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media); C5320 (Digital storage)",
  classification = "721; 722",
  corpsource =   "IBM General Products Div. Headquarters, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air bearing support; areal; data storage, magnetic;
                 disk file manufacturing; disk substrate; IBM 350;
                 magnetic; magnetic coating; magnetic disc and drum
                 storage; magnetic heads; magnetic read/write head;
                 recording; recording density; reviews; testing
                 techniques; tools",
  treatment =    "G General Review",
}

@Article{Beattie:1981:ITI,
  author =       "H. S. Beattie and R. A. Rahenkamp",
  title =        "{IBM} Typewriter Innovation",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "729--739",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper briefly highlights several significant
                 early milestones and then draws particular attention to
                 typewriter developments within the IBM Corporation.
                 Since the introduction of the SELECTRIC Typewriter, it
                 has evolved in several directions that resulted in the
                 following: a typewriter to produce high-quality
                 printing for cold-type composing applications; an
                 input\slash output writer for use in terminals,
                 computer consoles, and word processing machines; a
                 typewriter that can correct errors by mechanically
                 removing them from the page or covering them up; and
                 electronic typewriters, using microcircuitry, that
                 provide more memory and computing power than some early
                 computers.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5540 (Terminals and graphic displays)",
  classification = "745",
  corpsource =   "IBM Office Products Div. Lab., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer consoles; electric type bar machines;
                 electronic; high quality printing; IBM typewriter;
                 input/output writer; reviews; SELECTRIC; typewriter;
                 typewriters; word processing; word processing machines;
                 writing machine",
  treatment =    "G General Review",
}

@Article{May:1981:IWP,
  author =       "F. T. May",
  title =        "{IBM} Word Processing Developments",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "741--754 (or 741--753??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the evolution of word processing
                 product families and systems in IBM, with emphasis on
                 the key technological advances that have made possible
                 the great versatility and high performance available
                 today.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5540 (Terminals and graphic displays); C7100
                 (Business and administration)",
  classification = "723",
  corpsource =   "IBM Information Systems Div. Lab., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data processing; data processing systems; IBM word
                 processing developments; Magnetic; magnetic; office
                 environment; processing systems; quality printed
                 output; reviews; shared logic word; storage;
                 Tape/SELECTRIC Typewriter; typewriters; word
                 processing",
  treatment =    "G General Review",
}

@Article{Nickel:1981:PTI,
  author =       "T. Y. Nickel and F. J. Kania",
  title =        "Printer Technology in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "755--765",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Major developments in printer technology have occurred
                 during the past twenty-five years. Improvements in such
                 areas as performance, reliability, and product cost are
                 described in this paper, along with many of the IBM
                 impact printer products embodying these developments,
                 beginning with the well-known 1403 Line Printer.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "745",
  corpsource =   "IBM System Products Div. Lab., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1403 Line Printer; IBM impact printer products;
                 performance; printer technology; printers; printing
                 machinery; product cost; reliability; reviews",
  treatment =    "G General Review",
}

@Article{Elzinga:1981:LEP,
  author =       "C. D. Elzinga and T. M. Hallmark and R. H. {Mattern,
                 Jr.} and J. M. Woodward",
  title =        "Laser Electrophotographic Printing Technology",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "767--773",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the development of a non-impact
                 printing technology-electrophotography with laser
                 imaging --- and explains its implementation, in both
                 office product and system output devices. The key
                 technical advances made during the development of the
                 two devices are shown.",
  acknowledgement = ack-nhfb,
  classcodes =   "B4360 (Laser applications); B5180D (Electrostatic
                 devices); B8660 (Power applications in printing
                 industries); C5550 (Printers, plotters and other
                 hard-copy output devices)",
  classification = "745",
  corpsource =   "IBM General Products Div. Facility, Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "development; electrophotography; laser beam
                 applications; laser electrophotographic printing
                 technology; laser imaging; office product; printers;
                 printing; system output devices",
  treatment =    "P Practical",
}

@Article{Keyes:1981:SIP,
  author =       "R. W. Keyes and M. I. Nathan",
  title =        "Semiconductors at {IBM}: Physics, Novel Devices, and
                 Materials Science",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "779--792",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Work on semiconductor physics, devices, and materials
                 science carried on at IBM in the last twenty-five years
                 is reviewed. Topics covered include hot electrons,
                 inversion layers, the injection laser,
                 electroluminescence, the Gunn effect, MESFETs, solar
                 cells, superlattices, and amorphous materials and
                 effects.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0130R (Reviews and tutorial papers; resource
                 letters); A7220 (Electrical conductivity phenomena in
                 semiconductors and insulators); A7280 (Conductivity of
                 specific semiconductors and insulators); A7340
                 (Electrical and electronic properties of interfaces);
                 A8630J (Photoelectric conversion; solar cells and
                 arrays); B2520 (Semiconductor theory, materials and
                 properties); B2560 (Semiconductor devices); B4320J
                 (Semiconductor lasers); B8420 (Solar cells and
                 arrays)",
  classification = "714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amorphous materials; amorphous semiconductors;
                 electroluminescence; Gunn effect; hot carriers; hot
                 electrons; injection laser; inversion layers; materials
                 science; MESFETs; novel devices; physics; reviews;
                 Schottky gate field effect; semiconductor;
                 semiconductor devices; semiconductor junction lasers;
                 semiconductors; solar cells; superlattices;
                 transistors",
  treatment =    "B Bibliography; G General Review",
}

@Article{Bagus:1981:EST,
  author =       "Paul S. Bagus and Arthur R. Williams",
  title =        "Electronic Structure Theory",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "793--810 (or 793--809??)",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper briefly discusses the methods of ab initio
                 quantum chemistry, a field in which IBMers have devoted
                 major effort and made substantial innovative,
                 scientific contributions. Partly as a result of these
                 contributions, it is now possible to use these methods
                 to address theoretically problems of practical
                 importance in chemistry. Major contributions toward
                 understanding the electronic structure of solids,
                 particularly with regard to metallic bonding, surface
                 electronic structure, the nature of magnetism, and
                 semiconductor defects, are discussed as well as
                 pioneering efforts in the analysis of photoemission and
                 low-energy electron diffraction data.",
  acknowledgement = ack-nhfb,
  classcodes =   "A3120 (Specific calculations and results for atoms and
                 molecules); A7125 (Nonlocalized single-particle
                 electronic states); A7320 (Electronic surface states)",
  classification = "482; 531; 801",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "ab initio calculations; ab initio quantum chemistry;
                 atomic structure; band structure; bonding; bonds
                 (chemical); computations; crystals; diffraction data;
                 electrochemistry; electronic structure theory; history;
                 large scale; low energy electron; magnetism; metallic;
                 molecular electronic states; photoemission; physical
                 chemistry; reviews; semiconductor defects; solids;
                 surface electron states; surface electronic structure",
  treatment =    "B Bibliography; G General Review",
}

@Article{Muller:1981:PT,
  author =       "K. A. Muller and E. Pytte",
  title =        "Phase transitions",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "811--824",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A0130R (Reviews and tutorial papers; resource
                 letters); A6460 (General studies of phase transitions);
                 A6470K (Solid-solid transitions); A7530K (Magnetic
                 phase boundaries); A7780B (Ferroelectric transitions
                 and Curie point)",
  corpsource =   "IBM Res. Lab., Zurich, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ferroelectric; ferroelectric transitions; magnetic
                 transitions; magnetism; nonequilibrium phase
                 transitions; phase transitions; review; reviews;
                 solid-state phase transformations; structural;
                 transitions",
  treatment =    "B Bibliography; G General Review",
}

@Article{Pippenger:1981:ACT,
  author =       "Nicholas Pippenger",
  title =        "Algebraic complexity theory",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "5",
  pages =        "825--832",
  month =        sep,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68C25 (12-04 65F99 68-02)",
  MRnumber =     "82k:68020",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "473.68029",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory)",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebraic complexity; algebraic computations; bilinear
                 forms; computational complexity; matrix multiplication;
                 multiplication; polynomial; reviews; theory",
  treatment =    "B Bibliography; G General Review",
}

@Article{Schatzoff:1981:DEC,
  author =       "Martin Schatzoff",
  title =        "Design of Experiments in Computer Performance
                 Evaluation",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "848--859",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The purpose of this paper is to review some of the
                 basic concepts underlying the statistical design and
                 analysis of experiments and to illustrate them by means
                 of examples drawn from studies of computer system
                 performance. The examples include comparisons of
                 alternate page replacement and free storage management
                 algorithms, optimization of a scheduler, and validation
                 of a system simulation model.",
  acknowledgement = ack-nhfb,
  classcodes =   "C0310H (Equipment and software evaluation methods);
                 C5420 (Mainframes and minicomputers)",
  classification = "723",
  corpsource =   "IBM Data Processing Div. Sci. Center, Cambridge, MA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alternate page replacement; analysis; computer;
                 computer operating systems; computer selection and
                 evaluation; free; model; performance evaluation;
                 reviews; scheduler; statistical; statistical analysis;
                 statistical design; storage management algorithms;
                 system simulation",
  treatment =    "G General Review; P Practical",
}

@Article{Heidelberger:1981:ASM,
  author =       "Philip Heidelberger and Peter D. Welch",
  title =        "Adaptive Spectral Methods for Simulation Output
                 Analysis",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "860--876",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An earlier paper developed a method of confidence
                 interval generation based on the estimation of p(0)
                 through the least squares fit of a quadratic to the
                 logarithm of the periodogram. This method was applied
                 in a run length control procedure to a sequence of
                 batched means. This paper considers smoothing
                 techniques which adapt to the changing spectral shape
                 in an attempt to improve both the small and large
                 sample behavior of the method. The techniques
                 considered are polynomial smoothing with the degree
                 selected sequentially using standard regression
                 statistics, polynomial smoothing with the degree
                 selected by cross validation, and smoothing splines
                 with the amount of smoothing determined by cross
                 validation. These techniques were empirically evaluated
                 both for fixed sample sizes and when incorporated into
                 the sequential run length control procedure.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140Z (Other topics in statistics); C1220
                 (Simulation, modelling and identification); C7000
                 (Computer applications)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "batch means; batch sizes; computer simulation;
                 confidence intervals; covariance stationary; digital
                 simulation; polynomial; process; run length; simulation
                 methodology; smoothing; smoothing splines; smoothing
                 techniques; spectral analysis; spectral density;
                 storage requirements; time series",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Voldman:1981:SC,
  author =       "J. Voldman and Lee W. Hoevel",
  title =        "The software-cache connection",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "877--893",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an adaptation of standard Fourier
                 analysis techniques to the study of software-cache
                 interactions. The cache is viewed as a ``black box''
                 boolean signal generator, where ``ones'' correspond to
                 cache misses and ``zeros'' correspond to cache hits.
                 The spectrum of this time sequence is used to study the
                 dynamic characteristics of complex systems and
                 workloads with minimal a priori knowledge of their
                 internal organization. Line spectra identify tight
                 loops accessing regular data structures, while the
                 overall spectral density reveals the general structure
                 of instruction localities.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C6120 (File
                 organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; computer software; data
                 handling; data structures; dynamic characteristics;
                 instruction; internal organization; localities; regular
                 data structures; software-cache interactions; spectral
                 density; standard Fourier analysis; workloads",
  treatment =    "P Practical",
}

@Article{Sauer:1981:ASQ,
  author =       "Charles H. Sauer",
  title =        "Approximate Solution of Queueing Networks with
                 Simultaneous Resource Possession",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "894--903",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper extends previous methods for approximate
                 numerical solution of queueing networks with
                 homogeneous jobs and simultaneous resource possession
                 to networks with heterogeneous jobs and simultaneous
                 resource possession.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)B6210L (Computer communications); C1140C
                 (Queueing theory); C5620 (Computer networks and
                 techniques)",
  classification = "723; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer networks; heterogeneous jobs; possession;
                 probability --- Queueing Theory; product form solution;
                 queueing networks; queueing theory; simultaneous
                 resource",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hamacher:1981:CLA,
  author =       "V. Carl Hamacher and Gerald S. Shedler",
  title =        "Collision-Free Local Area Bus Network Performance
                 Analysis",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "904--914",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with port access control for local
                 area computer communication bus networks. Emphasizing
                 properties of the algorithms and delay-throughput
                 performance, paper focuses on two collision-free access
                 control schemes recently proposed by Eswaran, Hamacher,
                 and Shedler; it also provides a comparison of these
                 schemes to other available bus access techniques. The
                 performance analysis is based on representation of the
                 bus network as a closed queueing system with
                 nonpreemptive priority service.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)B6210L (Computer communications); C1140C
                 (Queueing theory); C5620 (Computer networks and
                 techniques)",
  classification = "723",
  corpsource =   "Dept. of Electrical Engng. and Computer Sci., Univ. of
                 Toronto, Toronto, Ont., Canada",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "closed queueing; collision-free access control;
                 computer networks; local area computer communication
                 bus; networks; nonpreemptive priority service; port
                 access control; queueing theory; system",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Calo:1981:DAT,
  author =       "S. B. Calo",
  title =        "Delay Analysis of a Two-Queue, Nonuniform Message
                 Channel",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "915--929",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25 (68A05 94A99)",
  MRnumber =     "84f:60122",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "465.68016",
  abstract =     "A Message Channel is defined as a tandem connection of
                 single server queues in which the successive service
                 times experienced by an particular customer are scaled
                 versions of the same random variable, and thus it
                 serves as a model for sparsely connected
                 store-and-forward data communications networks (or
                 network segments) where messages typically preserve
                 their lengths as they traverse the system. A particular
                 instance of such a nonstandard queueing model is
                 analyzed in this paper. The system consists of two
                 single server queues in tandem subject to a Poisson
                 arrival process (at the first queue) and providing
                 service according to scaled versions of a sequence of
                 two-level, discrete random variables. A set of
                 recursive equations that can be used to solve the model
                 for any given scaling factor at the second queue
                 (normalized with respect to the first queue service) is
                 explicitly derived.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)C1140C (Queueing theory); C5600 (Data
                 communication equipment and techniques)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer networks; computers; data communication
                 systems; equations; equilibrium mean cumulative
                 waiting; message switching; networks; Poisson arrival
                 process; queueing; queueing model; recursive; service
                 times; store-and-forward data communications; tandem
                 connection; theory; two-queue, nonuniform message
                 channel",
  treatment =    "A Application; T Theoretical or Mathematical",
  xxpages =      "915--930",
}

@Article{Stroebel:1981:MRT,
  author =       "Gary Stroebel",
  title =        "Message Reassembly Times in a Packet Network",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "930--933",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper addresses the problem of computing the
                 reassembly time of a multipacket message. All packets
                 from a single message are assumed to flow in sequence
                 along the same physical path. The analysis includes the
                 effects of contention between messages in the network
                 on the delay time at each station along the path and
                 its impact of message reassembly time.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6150 (Communication system theory); C5600 (Data
                 communication equipment and techniques)",
  classification = "723",
  corpsource =   "System Products Div. Lab., IBM Corp., Rochester, MN,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "communication networks; computer networks; computers
                 --- Data Communication Systems; contention; data
                 communication systems; message; multipacket message;
                 packet network; packet switching; reassembly time;
                 switching",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wesley:1981:FP,
  author =       "M. A. Wesley and G. Markowsky",
  title =        "Fleshing out Projections",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "934--954",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "52-04 (51M20 68G10)",
  MRnumber =     "84i:52002",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper extends the Wire Frame algorithm to
                 polyhedral objects described by a set of
                 two-dimensional projections such as might be seen on an
                 engineering drawing. The projection process may
                 introduce another level of ambiguity into
                 reconstruction problems and increases the possibility
                 of there being many objects with the same set of
                 projections. The Projections algorithm presented here
                 can work with very little information, for example,
                 only two projections, and find all possible objects
                 matching the data. However, it is seen that the number
                 of solutions may be very large and that it may be
                 reasonable to provide more information in the form of
                 three or more projections, by labeling corresponding
                 features in divers views, and by providing depth
                 information. The Projections algorithm is able to make
                 use of this extra information and can also accept other
                 forms of advice, such as whether given points are
                 inside material.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; CAM; computer graphics; cross sections; depth;
                 engineering drawings; information; pattern recognition;
                 polyhedral objects; solid; two dimensional projections;
                 wire frame algorithm",
  reviewer =     "Robert Connelly",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Meyer:1981:ESP,
  author =       "Jeanine Meyer",
  title =        "An emulation system for programmable sensory robots",
  journal =      j-IBM-JRD,
  volume =       "25",
  number =       "6",
  pages =        "955--962",
  month =        nov,
  year =         "1981",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes EMULA, an experimental
                 interactive system for the emulation of sensory robots.
                 EMULA was constructed as a bridge between an existing
                 language for driving actual robots and an existing
                 geometric modeling system. The modeling system was
                 extended to handle mechanisms, such as robots, and an
                 emulation language was introduced to indicate certain
                 specific physical effects, including sensory feedback,
                 grasping and releasing of parts, and gravity. EMULA
                 allows manipulation programs to be tested by users in
                 interactive terminal sessions or in batch mode.
                 Monitoring functions are provided to record actions,
                 store selected views, and check for collisions.",
  acknowledgement = ack-nhfb,
  classcodes =   "C3355 (Control applications in manufacturing
                 processes); C7440 (Civil and mechanical engineering
                 computing)",
  classification = "721; 731",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "digital simulation; EMULA interactive system;
                 emulation; geometric modeling; industrial robots;
                 interactive systems; manipulation programs;
                 programmable sensory robots; sensory feedback;
                 systems",
  treatment =    "A Application; P Practical",
}

@Article{Pittler:1982:SDT,
  author =       "Marvin S. Pittler and Don Michael Powers and Dorothy
                 L. Schnabel",
  title =        "System Development and Technology Aspects of the {IBM
                 3081} Processor Complex",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "2--11",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents an overview of the advances in
                 technology and in the design process, as well as
                 enhancements in the system design that were associated
                 with the development of the IBM 3081. Application of
                 LSI technology to the design of the 3081 Processor
                 Unit, which contains almost 800 000 logic circuits,
                 required extensions to silicon device packaging,
                 interconnection, and cooling technologies. A key
                 achievement in the 3081 is the incorporation of the
                 thermal conduction module (TCM), which contains as many
                 as 45 000 logic circuits, provides a cooling capacity
                 of up to 300 w, and allows the elimination of one
                 complete level of packaging --- the card level.
                 Reliability and serviceability objectives required new
                 approaches to error detection and fault isolation.
                 Innovations in system packaging and organization, and
                 extensive design verification by software and hardware
                 models, led to the realization of the increased
                 performance characteristics of the system.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B0170J
                 (Product packaging); B0170N (Reliability); B2570
                 (Semiconductor integrated circuits); C5420 (Mainframes
                 and minicomputers)",
  classification = "721; 722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "300 W cooling; 3081; aspects; capacity; card level
                 elimination; computer systems, digital; cooling
                 technologies; design engineering; design verification
                 by software; error detection; fault isolation; general
                 purpose computers; IBM 3081 Processor Complex;
                 integrated circuits --- Large Scale Integration;
                 integration; interconnection technology; large scale;
                 LSI packaging; module; packaging; Processor Unit;
                 reliability; serviceability; system design; system
                 packaging; technology; thermal conduction",
  treatment =    "G General Review",
}

@Article{Gustafson:1982:IPU,
  author =       "R. N. Gustafson and Frank J. Sparacio",
  title =        "{IBM 3081} Processor Unit: Design Considerations and
                 Design Process",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "12--21",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design aspects and the characteristics of the 3081
                 Processor Unit are described and the tradeoffs that
                 were made due to the implementation of LSI are
                 presented. A design strategy was chosen that included
                 tradeoffs covering the area of machine organization,
                 performance level, implementation costs, testing and
                 servicing aids, and development schedules. An
                 innovative verification effort was introduced into the
                 design process, capitalizing on a hardware flowcharting
                 discipline and rigorous design rules. On the basis of
                 this development experience, some thoughts concerning
                 VLSI implementations are explored.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B0170J
                 (Product packaging); B2570 (Semiconductor integrated
                 circuits); C5420 (Mainframes and minicomputers)",
  classification = "721; 722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "characteristics; computer systems, digital;
                 considerations; design; design engineering; design
                 process; development schedules; general purpose
                 computers; hardware flowcharting discipline; IBM 3081
                 Processor Unit; implementation costs; implementation of
                 LSI; innovative verification effort; integrated
                 circuits --- Large Scale Integration; integration;
                 large scale; machine organization; packaging;
                 performance level; rigorous design rules; servicing
                 aids; testing aids; tradeoffs; VLSI implementations",
  treatment =    "G General Review",
}

@Article{Reilly:1982:PCI,
  author =       "John Reilly and Arthur Sutton and Robert Nasser and
                 Robert Griscom",
  title =        "{Processor Controller} for the {IBM 3081}",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "22--29",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the Processor Controller unit of
                 the 3081 Processor Complex, which handles the functions
                 of maintenance, monitoring, and control of the system.
                 It discusses how this unit has dealt with these changes
                 to keep pace with the demands of advanced technology
                 and improved system availability. In providing the
                 necessary test and support functions of reset and
                 manual control, the Processor Controller exploits the
                 level-sensitive scan design capability of the 3081 to
                 obtain read\slash write access to all latches and
                 arrays. This design approach, coupled with
                 significantly expanded capabilities for error recovery,
                 configuration control, and diagnostics, has
                 significantly affected the structure and capabilities
                 of the Processor Controller.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); C5220
                 (Computer architecture)",
  classification = "721; 722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081; availability; computer architecture; computer
                 systems, digital; configuration control; control;
                 diagnostics; error recovery; large scale integration;
                 level-sensitive scan design capability; LSI
                 implementation; maintenance; monitoring; Processor
                 Complex; Processor Controller unit; read/write access
                 to all latches and arrays; system",
  treatment =    "G General Review",
}

@Article{Blodgett:1982:TCM,
  author =       "Albert J. {Blodgett, Jr.} and Donald R. Barbour",
  title =        "Thermal Conduction Module: a High-Performance
                 Multilayer Ceramic Package",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "30--36",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Innovations in package design coupled with major
                 advances in multilayer ceramic (MLC) technology provide
                 a high-performance LSI package for the IBM 3081
                 Processor Unit. The thermal conduction module (TCM)
                 utilizes a 90 multiplied by 90-mm MLC substrate to
                 interconnect up to 118 LSI devices. The substrate,
                 which typically contains 130 m of impedance-controlled
                 wiring, provides an array of 121 pads for solder
                 connections to each device and an array of 1800 pins
                 for interconnection with the next-level package. A
                 unique thermal design provides a cooling capacity of up
                 to 300 W. This paper describes the TCM design and
                 outlines the processes for fabrication of these
                 modules. The TCM is compared to prior technologies to
                 illustrate the improvements in packaging density,
                 reliability, and performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2220J (Hybrid integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "118 LSI devices interconnection; 1800 pins
                 interconnection; 90*90-mm MLC substrate; computer
                 systems, digital; cooling; density; dissipation 300;
                 electronics packaging; fabrication; hybrid ICs; hybrid
                 integrated circuits; IBM 3081 Processor Unit;
                 impedance-controlled; LSI package; module; multilayer
                 ceramic package; packaging; performance; reliability;
                 TCM; thermal conduction; thermal design; W; wiring",
  treatment =    "N New Development",
}

@Article{Seraphim:1982:NSP,
  author =       "Donald P. Seraphim",
  title =        "New Set of Printed-Circuit Technologies for the {IBM}
                 3081 Processor Unit",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "37--44",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new set of printed-circuit technologies have been
                 developed which permit construction of printed-circuit
                 panels with several kilometers of controlled-impedance
                 interconnections. Communications between internal
                 layers of signal planes are achieved through small
                 plated vias (drilled with a laser), while plated
                 through-holes are used for the logic service terminals
                 for cable terminations and module terminals. The panels
                 are the largest currently known in the industry, 600
                 multiplied by 700 mm, and have the most layers, 20.
                 This paper describes new LSI package designs which are
                 achievable with the exceptional versatility that the
                 new technologies provide. These technologies encompass
                 vacuum lamination, electroless plating, photosensitive
                 dielectric, laser drilling automatic twisted-pair wire
                 bonding, and other new approaches to printed
                 circuits.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2210B (Printed circuit
                 layout and design); B2210D (Printed circuit
                 manufacture)",
  classification = "703; 713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div. Lab., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "600*700 mm PCB; automatic twisted-pair wire; bonding;
                 circuits; computer systems, digital; conduction
                 modules; controlled-impedance interconnections;
                 dielectric; electroless plating; electronic equipment
                 manufacture; IBM 3081 Processor Unit; internal layers
                 of signal planes; laser drilling; LSI package designs;
                 multilayer PCB; packaging; panels; photosensitive;
                 plated through-holes; plated vias; printed; printed
                 circuits; printed-circuit; small; technologies;
                 thermal; vacuum lamination",
  treatment =    "A Application; N New Development",
}

@Article{Chu:1982:CCL,
  author =       "Richard C. Chu and Un Pah Hwang and Robert E. Simons",
  title =        "Conduction Cooling for an {LSI} Package: a
                 One-Dimensional Approach",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "45--54",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses an innovative conduction-cooling
                 approach using He gas encapsulation which has been
                 developed in response to the new LSI technology
                 requirements. Background is provided on the
                 liquid-encapsulated-module technology which preceded
                 the new approach, and the basic challenges encountered
                 in building a thermal bridge from individual chips to
                 the module and cold plate are described. The underlying
                 theory of operation is presented using one-dimensional
                 mathematical and discrete analog models. The effects of
                 various factors such as geometry, chip tilt, He
                 concentration, air leakage, and materials are
                 illustrated using these models.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2220J (Hybrid integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "713; 715; 721; 722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "air leakage; chip tilt; computers --- Circuits;
                 conduction-cooling; cooling; electronics packaging;
                 geometry; He concentration; He gas encapsulation;
                 hybrid ICs; hybrid integrated circuits; individual chip
                 cooling; integrated circuits; integration; junction
                 temperatures; large scale; multichip LSI packaging;
                 one-dimensional approach; operation; packaging;
                 sensitivity analysis; thermal; thermal design",
  treatment =    "A Application; N New Development",
}

@Article{Oktay:1982:CMH,
  author =       "Sevgin Oktay and Herbert C. Kammerer",
  title =        "Conduction-Cooled Module for High-Performance {LSI}
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "55--66",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the development and
                 implementation of a novel packaging concept which meets
                 the stringent and highly interactive demands on
                 cooling, reliability, and reworkability of LSI
                 technology. These requirements resulted in an
                 innovative packaging approach, referred to as the
                 thermal conduction module (TCM). The TCM uses
                 individually spring-loaded ``pistons'' that contact
                 each ship with helium gas, the conducting medium for
                 removing heat efficiently. A dismountable hermetic seal
                 makes multiple access possible for device and substrate
                 rework, while ensuring mechanical and environmental
                 protection of critical components. A wide range of
                 thermal, mechanical, and environmental experiments are
                 described with analytical and computer models.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2220J (Hybrid integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "713; 715",
  corpsource =   "IBM General Technol. Div. Lab., East Fishkill, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "conduction-cooled module; cooling; cooling medium;
                 dismountable hermetic seal; electronics packaging;
                 expected chip temperature distributions; He gas; He gas
                 encapsulation; hybrid integrated circuits; IBM 3081;
                 individually spring-loaded pistons; integrated
                 circuits; integration; large scale; modeling; module;
                 modules; multichip LSI packaging; packaging; packaging
                 concept; Processor Unit; reliability; reworkability;
                 TCM; thermal conduction; thermal performance;
                 three-dimensional computer",
  treatment =    "A Application; N New Development",
}

@Article{Bossen:1982:MTP,
  author =       "Douglas C. Bossen and M. Y. Hsiao",
  title =        "Model for Transient and Permanent Error-Detection and
                 Fault-Isolation Coverage",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "67--77",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The model developed in this paper allows the system
                 designer to project the dynamic error-detection and
                 fault-isolation coverages of the system as a function
                 of the failure rates of components and the types and
                 placement of error checkers, which has resulted in
                 significant improvements to both detection and
                 isolation in the IBM 3081 Processor Unit. The model has
                 also resulted in new probabilistic isolation strategies
                 based on the likelihood of failures. Our experiences
                 with this model on several IBM products, including the
                 3081, show good correlation between the model and
                 practical experiments.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B0170N
                 (Reliability)C5210 (Logic design methods); C5220
                 (Computer architecture)",
  classification = "722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis of; captured information; computer; computer
                 maintenance; computer systems, digital; design; dynamic
                 error detection; error checking; error detection; error
                 detection model; failure analysis; failure rates of
                 components; fault tolerant computing; fault-isolation
                 coverage; IBM 3081; likelihood of failures; logic
                 testing; permanent error-detection; probabilistic
                 isolation strategies; Processor Unit; transient error
                 detection",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Tendolkar:1982:ADM,
  author =       "Nandakumar N. Tendolkar and Robert L. Swann",
  title =        "Automated Diagnostic Methodology for the {IBM 3081}
                 Processor Complex",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "78--88",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The concepts of automated diagnostics that were
                 developed for and that are implemented in the IBM 3081
                 Processor Complex are presented in this paper.
                 Significant features of the 3081 diagnostics
                 methodology are the capability to isolate intermittent
                 as well as solid hardware failures, and the automatic
                 isolation of a failure to the failing field-replaceable
                 unit (FRU) in a high percentage of the cases. These
                 features, which permit a considerable reduction in the
                 time to repair a failure as compared to previous
                 systems, are achieved by designing a machine which has
                 a very high level of error-detection capability as well
                 as special functions to facilitate fault isolation
                 using Level-Sensitive Scan Design (LSSD), and which
                 includes a Processor Controller to implement diagnostic
                 microprograms. Intermittent failures are isolated by
                 analyzing data captured at the detection of the error,
                 and the analysis is concurrent with customer operations
                 if the error is recoverable.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210 (Logic design methods); C5420 (Mainframes and
                 minicomputers); C6150G (Diagnostic, testing, debugging
                 and evaluating systems)",
  classification = "722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated diagnostics; automatic testing;
                 automatically; complex; computer systems, digital;
                 computer testing; error-detection capability; fault
                 isolation; fault location; field-replaceable unit;
                 generated validation tests; IBM 3081 processor;
                 intermittent failures isolation; Level-Sensitive; logic
                 testing; LSSD; Processor Controller; Scan Design; solid
                 failures isolation; stuck faults; time to repair
                 reduction",
  treatment =    "G General Review",
}

@Article{Monachino:1982:DVS,
  author =       "Michael Monachino",
  title =        "Design Verification System for Large-Scale {LSI}
                 Designs",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "89--99",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper discusses the use of software modeling
                 techniques to verify LSI hardware designs, methods used
                 for deciding when modeling should be stopped and
                 hardware can be built with sufficient assurance to
                 permit additional verification to continue on the
                 hardware, methods for testing the hardware as it is
                 assembled into a very large processor complex, and the
                 organization of the design verification system to avoid
                 duplicate creation of test cases for different stages
                 of the design process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570 (Semiconductor integrated circuits); C5210B
                 (Computer-aided logic design); C7410D (Electronic
                 engineering computing)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 system; computer systems, digital; design; design
                 verification system; implementation process; integrated
                 circuits; large scale integration; large-scale hardware
                 designs; logic CAD; LSI; software modeling techniques;
                 very large processor complex",
  treatment =    "G General Review",
}

@Article{Hitchcock:1982:TAC,
  author =       "Robert B. {Hitchcock, Sr.} and Gordon L. Smith and
                 David D. Cheng",
  title =        "Timing Analysis of Computer Hardware",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "100--105",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Timing Analysis is a design automation program that
                 assists computer design engineers in locating problem
                 timing in a clocked, sequential machine. The program is
                 effective for large machines because, in part, the
                 running time is proportional to the number of circuits.
                 This is in contrast to alternative techniques such as
                 delay simulation, which requires large numbers of test
                 patterns, and path tracing, which requires tracing of
                 all paths. The program also generates standard
                 deviations for the times so that a statistical timing
                 design can be produced rather than a worst case
                 approach. This system has successfully detected all but
                 a few timing problems for the IBM 3081 Processor Unit
                 (consisting of almost 800 000 circuits) prior to the
                 hardware debugging of timing. The 3081 is characterized
                 by a tight statistical timing design.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5210B (Computer-aided logic design); C7430 (Computer
                 engineering)",
  classification = "722",
  corpsource =   "IBM General Technol. Div. Lab., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer hardware; computer systems, digital;
                 computing design; design automation program; IBM 3081
                 Processor Unit; integrated circuits --- Large Scale
                 Integration; locating problem timing; logic CAD;
                 machine; sequential; standard deviations; statistical;
                 Timing Analysis; timing design",
  treatment =    "G General Review",
}

@Article{Smith:1982:BCH,
  author =       "Gordon L. Smith and Ralph J. Bahnsen and Harry
                 Halliwell",
  title =        "{Boolean} Comparison of Hardware and Flowcharts",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "1",
  pages =        "106--116",
  month =        jan,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Boolean comparison is a design verification technique
                 in which two logic networks are compared for functional
                 equivalence using analysis rather than simulation.
                 Boolean comparison was used on the IBM 3081 project to
                 establish that hardware flowcharts and the detailed
                 hardware logic design were functionally equivalent.
                 Hardware flowcharts are a graphic form of a hardware
                 description language which describes the logical
                 behavior of the machine in terms of the inputs,
                 outputs, and latches. The logical correctness of the
                 hardware flowcharts was previously established via
                 cycle simulation. The concepts and techniques of
                 Boolean comparison as used on the IBM 3081 project are
                 described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210B (Computer-aided logic
                 design); C6110 (Systems analysis and programming)",
  classification = "721; 722",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Boolean comparison; computer systems, digital; design
                 verification; flowcharting; hardware; hardware
                 flowcharts; IBM 3081 project; integrated logic
                 circuits; integration; large scale; logic CAD; logic
                 design; technique",
  treatment =    "A Application; G General Review",
}

@Article{vonGutfeld:1982:LPE,
  author =       "R. J. {von Gutfeld} and R. E. Acosta and L. T.
                 Romankiw",
  title =        "Laser-Enhanced Plating and Etching: Mechanisms and
                 Applications",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "136--144",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A laser beam impinging on an electrode is used to
                 enhance local electroplating or etching rates by
                 several orders of magnitude, and it is possible to
                 produce very highly localized electroless plating at
                 high deposition rates, to greatly enhance and localize
                 the typical metal-exchange (immersion) plating
                 reactions, to obtain thermo-battery-driven reactions
                 with simple single-element aqueous solutions, and to
                 greatly enhance localized chemical etching. The recent
                 experiments and the observed laser plating and etching
                 enhancement phenomena are explored. Some examples of
                 laser-enhanced plating requiring no external power
                 sources are also described. Applications of these new
                 techniques, particularly to maskless microcircuit
                 repair and design changes, are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180B (Ultraviolet, visible and infrared radiation
                 effects); A6855 (Thin film growth, structure, and
                 epitaxy); A8115L (Deposition from liquid phases (melts
                 and solutions)); A8160C (Surface treatment and
                 degradation of semiconductors); B2550E (Surface
                 treatment for semiconductor devices); B2550F
                 (Metallisation and interconnection technology); B4360
                 (Laser applications); B8620 (Power applications in
                 manufacturing industries)",
  classification = "539; 744",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "applications; circuit personalization; electrodeless
                 plating; electroplating; etching; etching techniques;
                 exchange; focused laser beam; hydrodynamic stirring;
                 increase in temperature; laser beam applications; laser
                 enhanced etching; laser-enhanced plating; local; local
                 charge-transfer kinetics; mechanisms; metallisation;
                 micron-sized; plating; semiconductor technology",
  treatment =    "N New Development; X Experimental",
}

@Article{Chuang:1982:LCE,
  author =       "T. J. Chuang",
  title =        "Laser-Enhanced Chemical Etching of Solid Surfaces",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "145--151 (or 145--150??)",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The laser-enhanced chemical etching of Si, SiO$_2$,
                 Ta, and Te films with halogen-containing gases excited
                 by a pulsed CO$_2$ laser and a continuous-wave (cw)
                 Ar** plus laser has been studied. Detailed measurements
                 of the etch rates as functions of the laser frequency,
                 the laser intensity, and the gas pressure have been
                 performed for some of the gas-solid systems. The
                 enhanced surface reactions have been classified into
                 three categories: those activated by the vibrational
                 excitation of the etchant molecules, those with
                 radicals generated by photodissociation, and those
                 induced by laser excitation of solid substrates.
                 Examples which illustrate the effects of laser
                 radiation on these surface photochemical processes are
                 given.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6180B (Ultraviolet, visible and infrared radiation
                 effects); A8160B (Surface treatment and degradation of
                 metals and alloys); A8160C (Surface treatment and
                 degradation of semiconductors); B2520C (Elemental
                 semiconductors); B2550E (Surface treatment for
                 semiconductor devices); B4360 (Laser applications)",
  classification = "531; 744",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "applications; Ar/sup +/; compounds; elemental
                 semiconductors; enhanced surface reactions; etch rates;
                 etching; excitation; gas; gas lasers;
                 halogen-containing gases; laser; laser beam; laser
                 excitation of solid; laser frequency; laser intensity;
                 laser-enhanced chemical etching; photodissociation;
                 pressure; pulsed CO$_2$ laser; resolutions;
                 semiconductor technology; Si; silicon; SiO$_2$;
                 spatial; substrates; surface photochemical processes;
                 Ta; tantalum; Te; tellurium; vibrational",
  treatment =    "N New Development",
}

@Article{Jain:1982:UHC,
  author =       "K. Jain and C. G. Willson and B. J. Lin",
  title =        "Ultrafast High-Resolution Contact Lithography with
                 Excimer Lasers",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "151--159",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new technique for speckle-free, fine-line high-speed
                 lithography using high-power pulsed excimer lasers is
                 described and demonstrated. Use of stimulated Raman
                 shifting is proposed for obtaining the most desirable
                 set of spectral lines for any resist. This permits the
                 optimization of the exposure wavelengths for a given
                 resist. Excellent quality images are obtained in
                 1-$\mu$m-thick diazo-type photoresists by means of
                 contact printing with a XeCl laser at 308 nm and a KrF
                 laser at 248 nm. These images are comparable to
                 state-of-the-art contact lithography obtained with
                 conventional lamps, but the excimer laser technique is
                 approximately two orders of magnitude faster.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); B4320C (Gas lasers); B4360 (Laser
                 applications)",
  classification = "745",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1000 line pairs/mm; AZ-2400; compounds; contact;
                 contact lithography; diazo-type photoresists;
                 diazonaphthoquinone-Novolak resist; excimer lasers;
                 exposure wavelength optimisation; fine-line high-speed
                 lithography; high-power pulsed excimer;
                 high-resolution; KrF laser; krypton compounds; lasers;
                 lithography; photolithography; printing; reciprocity
                 failure; speckle-free; stimulated Raman shifting; UV;
                 XeCl laser; xenon",
  treatment =    "N New Development; X Experimental",
}

@Article{Levenson:1982:IPN,
  author =       "M. D. Levenson and K. Chiang",
  title =        "Image Projection with Nonlinear Optics",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "160--170",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The nonlinear optical process of conjugate wavefront
                 generation by degenerate four-wave mixing can project
                 images in a manner akin to conventional optical
                 systems. The underlying physics is quite different, and
                 the difference allows higher resolution over larger
                 useful fields. This article reviews the basics of
                 conjugate wavefront generation and its relationship to
                 holography, and proposes applications in fine-line
                 lithography. Initial experiments confirm the predicted
                 advantages but also point out inadequacies in
                 present-day nonlinear optics technology.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4265F (Optical phase conjugation); B2550G
                 (Lithography); B2570 (Semiconductor integrated
                 circuits); B4340 (Nonlinear optics and devices)",
  classification = "741",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "advantages; applications in fine-line lithography;
                 conjugate wavefront; degenerate four-wave mixing;
                 generation; holography; image processing; image
                 projection; inadequacies; nonlinear optics; optical
                 phase conjugation; optical projectors;
                 photolithography",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Kiang:1982:MSD,
  author =       "Ying C. Kiang and J. Randal Moulic and Wei-Kan Chu and
                 Andrew C. Yen",
  title =        "Modification of Semiconductor Device Characteristics
                 by Lasers",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "171--176",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper discusses an emerging area of
                 laser-semiconductor processing: the effect of laser
                 irradiation on the electrical parameters of
                 diffused-function devices. Shallow diffusion of 0.2- to
                 0.5-$\mu$m depths have been achieved. Transistor
                 current gains have been modified and the results agree
                 with the theoretical analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550B (Semiconductor doping); B4360 (Laser
                 applications)",
  classification = "713",
  corpsource =   "IBM Data Systems Div. Lab., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "diffused-junction devices; effect of laser
                 irradiation; electrical parameters; integrated circuit
                 manufacture; laser beam annealing; laser-semiconductor
                 processing; semiconductor; semiconductor devices;
                 semiconductor doping; shallow diffusions; technology;
                 transistor current gains modification",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Dewey:1982:AGL,
  author =       "A. G. Dewey and J. D. Crow",
  title =        "Application of {GaAlAs} Lasers to High-Resolution
                 Liquid-Crystal Projection Displays",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "177--185",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Because of the proximity of the injection laser's
                 wavelength to the visible spectrum used in the display
                 projection system, and because of divergence of the
                 beams in the optical delivery system, a reflective LC
                 cell was designed. Almost total absorption of the
                 GaAlAs laser beam was achieved. This paper discusses
                 the thermal and optical properties of the cell and
                 their effect on the writing characteristics and the
                 quality of the projected image (contrast and
                 brightness). An off-axis projection system, which was
                 designed for use with the refective cell, creates a
                 high-resolution image on the screen.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2520D (II-VI and III-V semiconductors); B4125 (Fibre
                 optics)B4150D (Liquid crystal devices); B4320J
                 (Semiconductor lasers); B4360 (Laser applications);
                 B7260 (Display technology and systems)",
  classification = "741; 744",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "application; brightness; characteristics; contrast;
                 crystal displays; display devices --- Laser
                 Applications; fiber optic delivery system; fibre
                 optics; GaAlAs lasers; gallium arsenide; high-;
                 high-resolution liquid-crystal projection displays;
                 III-V semiconductors; lasers, semiconductor; liquid;
                 multispot; off-axis projection; optical properties;
                 powered lasers; reflective cell; scanner system;
                 semiconductor injection lasers; semiconductor junction
                 lasers; system; writing",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Tam:1982:LE,
  author =       "Andrew C. Tam and Richard D. Balanson",
  title =        "Lasers in Electrophotography",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "186--197",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental investigations of the photogeneration and
                 transport processes utilized in electrophotography are
                 now possible because of the short pulse duration, high
                 peak power, high collimation, monochromaticity,
                 and\slash or coherence of a laser source. Also, the
                 increasing availability of reliable and inexpensive
                 lasers has resulted in many new technological uses of
                 lasers in electrophotographic applications. In addition
                 to the continued use of HeNe and HeCd lasers, new
                 products have been configured with GaAs lasers.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0768 (Photography, photographic instruments and
                 techniques); A4260K (Laser beam applications); B2520D
                 (II-VI and III-V semiconductors); B4320C (Gas lasers);
                 B4320J (Semiconductor lasers); B4360 (Laser
                 applications)",
  classification = "744; 745",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cadmium; electrophotography; GaAs lasers; gallium
                 arsenide; gas lasers; He-Cd; He-Ne lasers; helium; ion
                 lasers; laser sources; lasers; neon; photography;
                 semiconductor junction lasers",
  treatment =    "A Application; X Experimental",
}

@Article{Gutierrez:1982:MPH,
  author =       "A. R. Gutierrez and J. Friedrich and D. Haarer and H.
                 Wolfrum",
  title =        "Multiple Photochemical Hole Burning in Organic Glasses
                 and Polymers: Spectroscopy and Storage Aspects",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "198--208",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A scheme for optical information storage using
                 photochemical hole burning (PHB) in amorphous systems
                 is evaluated. Limits imposed by the nature of PHB in
                 polymers and glasses and its dependence on temperature
                 are discussed. It is demonstrated that optical
                 information storage can be multiplexed by a factor of
                 10**3 using the frequency dimension and PHB.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4230N (Optical storage and retrieval); A4270F (Other
                 optical materials); B4110 (Optical materials); C5320K
                 (Optical storage)",
  classification = "741; 744; 803; 804; 812",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amorphous systems; data storage, optical; dependence
                 on temperature; frequency dimension; glass --- Organic
                 Compounds; multiplexed by factor 10/sup 3/; optical
                 glass; optical information; optical storage; organic
                 glasses; photochemical hole burning; polymers;
                 spectroscopy; storage",
  treatment =    "N New Development; X Experimental",
}

@Article{Rabolt:1982:IOR,
  author =       "J. F. Rabolt and R. Santo and N. E. Schlotter and J.
                 D. Swalen",
  title =        "Integrated Optics and {Raman} Scattering: Molecular
                 Orientation in Thin Polymer Films and
                 {Langmuir-Blodgett} Monolayers",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "209--216",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Studies of submicron films and molecular monolayers
                 with infrared and Raman spectroscopy have been hampered
                 by the inability of current spectroscopic techniques to
                 detect the minute amount of material present in these
                 thin-film assemblies. A method for overcoming this
                 problem by using integrated optics has been
                 successfully demonstrated. In the case of Raman
                 studies, the material whose spectrum was desired was
                 made into an asymmetric slab waveguide or a composite
                 waveguide structure in which both the optical field
                 intensity of the in-coupled laser source and the
                 scattering volume of the sample have been significantly
                 increased.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0765 (Optical spectroscopy and spectrometers)",
  classification = "741",
  corpsource =   "IBM Res. Div. Lab., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "composite waveguide structure; integrated; integrated
                 optics; Langmuir films; Langmuir-Blodgett;
                 measurements; molecular; monolayers; optical
                 waveguides; optics; orientation; polarized Raman;
                 Raman; Raman scattering; Raman spectroscopy;
                 spectroscopy; submicron films; thin film optical
                 waveguides; thin polymer films",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Brauchle:1982:NCM,
  author =       "Chr. Br{\"a}uchle and Urs P. Wild and D. M. Burland
                 and G. C. Bjorklund and D. C. Alvarez",
  title =        "A new class of materials for holography in the
                 infrared",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "217--227",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new class of holographic materials is described.
                 These materials undergo four-level two-photon
                 photochemistry. The holograms recorded in these
                 materials are self-developing and are not erased during
                 reading. Furthermore, the recording process may be
                 gated off and on by using an auxiliary incoherent light
                 source. As a specific example of such a system,
                 holograms formed using samples of an alpha -diketone
                 dissolved in poly(cyanoacrylate) are described. Gated
                 holograms have been recorded in this material at 752
                 and 1064 nm.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4230N (Optical storage and retrieval); A4240K
                 (Holographic interferometry; other holographic
                 techniques); A4270G (Light-sensitive materials); B0560
                 (Polymers and plastics (engineering materials
                 science)); B4110 (Optical materials); B4350
                 (Holography)",
  classification = "745",
  corpsource =   "Inst. of Phys. Chem., Univ. of Munich, Munich, West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alpha diketone; auxiliary incoherent light source;
                 four-level two-photon; gated holograms; holographic
                 materials; holographic storage; holography; infrared;
                 infrared imaging; IR holography; photochemistry;
                 poly(cyanoacrylate); polymers; self developing
                 holograms; wavelength 1064 nm; wavelength 752 nm",
  treatment =    "N New Development; T Theoretical or Mathematical; X
                 Experimental",
  xxauthor =     "C. Brauchle and U. P. Wild and D. M. Burland and G. C.
                 Bjorklund and D. C. Alvarez",
}

@Article{Dickson:1982:HIS,
  author =       "LeRoy D. Dickson and Glenn T. Sincerbox and Albert D.
                 Wolfheimer",
  title =        "Holography in the {IBM 3687} Supermarket Scanner",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "228--234",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The IBM 3687 Supermarket Scanner is described, with
                 emphasis on the holographic deflector disk used to
                 create the scan pattern. The scanner exploits the
                 functional advantages of holography to create a dense,
                 multiple-focal-plane scan pattern with small spot size
                 and large depth of field. The optical design of the
                 holographic disk is discussed and basic disk
                 fabrication concepts are introduced.",
  acknowledgement = ack-nhfb,
  classcodes =   "A4240K (Holographic interferometry; other holographic
                 techniques); B4350 (Holography); C7160 (Manufacturing
                 and industrial administration)",
  classification = "745",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "design; fabrication; holographic deflector disk;
                 holographic instruments; holography; IBM 3687
                 Supermarket Scanner; large depth of field;
                 multiple-focal-plane; optical; point of sale systems;
                 POS; scan pattern; small spot size",
  treatment =    "A Application; N New Development",
}

@Article{Hodgson:1982:LAC,
  author =       "R. T. Hodgson and Andre B. Minn and James D.
                 Rockrohr",
  title =        "Laser-Induced Arcing in Cathode Ray Tubes",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "235--241",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Laser-induced arcing in cathode ray tubes has been
                 used to study the effect of spontaneous internal
                 high-voltage arcs under normal operating conditions.
                 Ruby and Nd:YAG laser systems were compared as laser
                 sources for the breakdown. Various arc-suppression
                 schemes for CRT systems were evaluated for future
                 use.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5280M (Arcs and sparks); B2315 (Gas discharges);
                 B2360 (Electron beam scanned tubes); B4360 (Laser
                 applications)",
  classification = "714; 744",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arc-; arcs (electric); cathode ray tubes; cathode-ray
                 tubes; conditions; CRT systems; electron tubes, cathode
                 ray; laser beam applications; laser induced arcing;
                 laser sources; Nd:YAG laser systems; normal operating;
                 ruby laser systems; spontaneous internal high-voltage
                 arcs; suppression schemes",
  treatment =    "A Application; X Experimental",
}

@Article{Hofmann:1982:PAS,
  author =       "J. Hofmann and H. Schmutz",
  title =        "Performance Analysis of Suspend Locks in Operating
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "2",
  pages =        "242--259",
  month =        mar,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Performance models of suspend locks in operating
                 systems are developed and analyzed. Analytical
                 expressions and algorithms for numerical results have
                 been obtained for an arbitrary number of processors, an
                 arbitrary number of tasks, and one suspend lock. The
                 results are discussed and important dependencies among
                 the major characteristic quantities such as queue
                 length, processor speed, number of processors,
                 dispatching overhead, and processor degradation are
                 shown. Expressions are derived permitting the control
                 program designer to estimate the system impact of
                 locking during the early design phase.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150J (Operating systems)",
  classification = "721; 722; 723",
  corpsource =   "Fachhochschule, Heilbronn, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arbitrary; arbitrary number of processors; computer
                 operating systems; dependencies between
                 characteristics; dispatching overhead; logic devices;
                 number of; number of tasks; operating systems;
                 processor degradation; processor speed; processors;
                 queue length; supervisory and executive programs;
                 suspend locks in; system impact",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Bendz:1982:CPS,
  author =       "D. J. Bendz and R. W. Gedney and J. Rasile",
  title =        "Cost\slash Performance Single-Chip Module",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "278--285",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The introduction of the high performance T**2L device
                 technology for the IBM 4300 Systems and the
                 System\slash 38 required extensions of the 24-mm
                 metallized ceramic module used in prior IBM systems.
                 The extension of the metallized ceramic technology into
                 a physically larger 28-mm module, electrically enhanced
                 with a reference plane and with fine line (0.025-mm)
                 wiring, is described. The reliability of this module
                 was evaluated with particular emphasis on corrosion and
                 metal migration in humid environments and on exposure
                 to atmospheric contaminants.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B0170N (Reliability);
                 B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits); C5120 (Logic and switching circuits)",
  classification = "714; 721; 722",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atmospheric contaminants; bipolar chip; bipolar
                 integrated circuits; circuit reliability; computers ---
                 Circuits; corrosion; encapsulation; environmental
                 testing; humid environments; IBM 4300; integrated
                 circuit; integrated logic circuits; logic devices;
                 metal; metallized ceramic module; migration; module;
                 modules; packaging; reliability; single-chip;
                 System/38; T/sup 2/L device technology; testing;
                 transistor-transistor logic; TTL",
  treatment =    "A Application; P Practical",
}

@Article{Ho:1982:TMH,
  author =       "C. W. Ho and D. A. Chance and C. H. Bajorek and R. E.
                 Acosta",
  title =        "Thin-Film Module as a High-Performance Semiconductor
                 Package",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "286--296",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses a multichip module for future
                 VLSI computer packages on which an array of silicon
                 chips is directly attached and interconnected by
                 high-density thin-film lossy transmission lines. Since
                 the high-performance VLSI chips contain a large number
                 of off-chip driver circuits which are allowed to switch
                 simultaneously in operation, low-inductance on-module
                 capacitors are found to be essential for stabilizing
                 the on-module power supply. Novel on-module capacitor
                 structures are therefore proposed, discussed, and
                 evaluated. Material systems and processing techniques
                 for both the thin-film interconnection lines and the
                 capacitor structures are also briefly discussed in the
                 paper. Development of novel defect detection and repair
                 techniques has been identified as essential for
                 fabricating the Thin-Film Module with practical
                 yields.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2220E (Thin film
                 circuits); B2220J (Hybrid integrated circuits); B2240
                 (Microassembly techniques); B2570 (Semiconductor
                 integrated circuits)",
  classification = "713; 714; 721; 722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "capacitors; computers --- Circuits; high-density
                 thin-film lossy; high-performance semiconductor
                 package; hybrid integrated circuits; integrated
                 circuits; integration; large scale; low-inductance
                 on-module capacitors; module power supply; modules;
                 multichip module; multilayer ceramic technology; on-;
                 packaging; semiconductor device manufacture; Si chips;
                 thin film circuits; thin-film module; transmission
                 lines; VLSI computer packages",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Bonner:1982:APB,
  author =       "Roy F. Bonner and John A. Asselta and Frank W.
                 Haining",
  title =        "Advanced Printed-Circuit Board Design for
                 High-Performance Computer Applications",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "297--305",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new integrated circuit packaging structure was
                 needed to support the new 90-mm multilayer ceramic
                 modules, known as Thermal Conduction Modules (TCMs),
                 used in the IBM 3081 computers. The structure developed
                 eliminates one level of packaging (the card level) and
                 allows up to nine TCMs to be plugged directly into a
                 large multilayer printed-circuit board using a new
                 zero-insertion-force connector system. The board has 18
                 internal circuit planes for signal and power
                 distribution and accommodates new signal cabling, power
                 bus, terminating resistors, decoupling capacitors, and
                 cooling hardware, forming a packaged unit of up to a
                 quarter million logic gates and half a million bits of
                 memory. This paper focuses on the detailed design of
                 the printed-circuit board and on its signal and power
                 transmission characteristics.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2210B (Printed circuit
                 layout and design)",
  classification = "703; 713; 722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 computers; 90-mm; applications; capacitors;
                 characteristics; circuit board design; cooling
                 hardware; decoupling; high-performance computer; IBM;
                 integrated circuit packaging structure; integrated
                 circuits; modules; multilayer ceramic modules;
                 multilayer PCB; packaging; power bus; power
                 transmission; printed circuits; printed-; signal
                 cabling; signal transmission characteristics;
                 terminating resistors; thermal conduction modules;
                 zero-insertion-force connector system",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Bupp:1982:HBF,
  author =       "J. R. Bupp and L. N. Chellis and R. E. Ruane and J. P.
                 Wiley",
  title =        "High-Density Board Fabrication Techniques",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "306--317",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A variety of construction methods can be used to form
                 high-density printed-circuit boards. The electrical and
                 mechanical requirements of a design strongly influence
                 the choice of processes used to produce the finished
                 product. The introduction of physically large
                 high-density boards required the development of many
                 new processes, several of which are critical to the
                 electrical performance of the composite. In this paper
                 the process sequence employed in the fabrication of the
                 3081 high-density board is described, with particular
                 emphasis on the selection of the critical processes
                 used in its manufacture. The 3081 registration system
                 is also discussed, and a new method for merging
                 through-hole location data with the data representing
                 the location of the conducting layers is presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2210D (Printed circuit
                 manufacture)",
  classification = "703; 713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 registration system; boards; circuits; conducting
                 layers; construction; electronic equipment manufacture;
                 fabrication; high-density printed-circuit; manufacture;
                 mechanical requirements; packaging; PCB; printed;
                 printed circuits; through-hole location data",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Babuka:1982:DIT,
  author =       "R. Babuka and G. J. {Saxenmeyer, Jr.} and L. K.
                 Schultz",
  title =        "Development of Interconnection Technology for
                 Large-Scale Integrated Circuits",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "318--327",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The size, cost, reliability, and serviceability of
                 modern large data processing systems are influenced by
                 the electrical interconnections required among the
                 hundreds or thousands of chips they contain. The
                 development of the complex inteconnection design scheme
                 is profoundly influenced by the interactions among the
                 component and subassembly designs: modules,
                 printed-circuit boards, cables, connectors, etc. The
                 design scheme is also strongly affected by the
                 constraints imposed by manufacturing process
                 limitations and by environmental factors, such as
                 cooling and corrosion. This paper deals with these
                 interactions and constraints as encountered in the
                 interconnection design of the IBM 3081 system and the
                 design discipline required to deal with them.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B0170N (Reliability);
                 B2180E (Connectors); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boards; chips; circuit reliability; computers ---
                 Circuits; connectors; cooling; corrosion; data
                 processing systems; design scheme; electric connectors;
                 electrical interconnections; electronic; environmental
                 factors; equipment manufacture; IBM 3081; integrated
                 circuits; interconnection design scheme; large; large
                 scale integration; large-scale integrated circuits;
                 LSI; manufacturing process; modules; printed-circuit;
                 reliability",
  treatment =    "A Application; P Practical",
}

@Article{Koch:1982:ILP,
  author =       "J. H. {Koch III} and W. F. Mikhail and W. R. Heller",
  title =        "Influence on {LSI} Package Wireability of via
                 Availability and Wiring Track Accessibility",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "328--341",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experiments are reported which use automatic global
                 and line-packing wiring routines, supplemented by a
                 restricted maze runner, to evaluate the overall
                 influences of several important physical variables upon
                 the wireability of several logic-circuit package types.
                 The logic circuits are contained in subpackages (e.g.,
                 modules carrying chips), which are inserted, using
                 pins, into the carrier package in a regular array of
                 holes otherwise available as vias interconnecting the
                 wiring planes. Over a range of connection counts from
                 several hundred to several thousand, it is found that
                 ``overflows'' (connections not wired by the program)
                 amounting to as much as 10 or 15\% of the wires can be
                 substantially reduced in number by careful design. This
                 can be done by using a sufficient number of
                 programmable vias (greater than one per used pin) and
                 by using a track grid ensuring maximum global track
                 accessibility to all pins, or by a combination of both
                 of these tactics in conjunction with suitable wiring
                 algorithms. Some simple theoretical arguments are given
                 which characterize the design problem in the light of
                 the results.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2210B (Printed circuit
                 layout and design); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 714; 721",
  corpsource =   "IBM General Technol. Div., East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "global; integrated circuits; large scale integration;
                 line-packing wiring; logic circuits; LSI package
                 wireability; modules; packaging; programmable vias;
                 restricted maze; runner; track accessibility; via
                 availability; wiring",
  treatment =    "P Practical; X Experimental",
}

@Article{Vilkelis:1982:LRA,
  author =       "W. V. Vilkelis",
  title =        "Lead Reduction Among Combinatorial Logic Circuits",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "342--348",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper provides a description of the behavior of
                 lead reduction among combinatorial logic circuits.
                 Methods by which one may design the lead reduction
                 architecture for modular packaging schemes are
                 developed. The methods are then applied to the design
                 of the lead reduction architecture of an integrated
                 circuit chip and a nine-chip cell.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B1265B (Logic circuits);
                 B2570 (Semiconductor integrated circuits); C5120 (Logic
                 and switching circuits)",
  classification = "713; 721; 722",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "combinatorial circuits; combinatorial logic circuits;
                 computers --- Circuits; gate array; integrated circuit
                 chip; integrated logic circuits; large; lead reduction;
                 logic circuits; LSI; modular packaging schemes;
                 modules; nine-chip cell; packaging; scale integration;
                 Si masterslice",
  treatment =    "A Application; P Practical",
}

@Article{Davidson:1982:EDH,
  author =       "E. E. Davidson",
  title =        "Electrical Design of a High Speed Computer Package",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "349--361",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A methodology for optimizing the design of an
                 electrical packaging system for a high speed computer
                 is described. The pertinent parameters are first
                 defined and their sensitivities are derived so that the
                 proper design trade-offs can ultimately be made. From
                 this procedure, a set of rules is generated for driving
                 a computer aided design system. Finally, there is a
                 discussion of design optimization and circuit and
                 package effects on machine performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); C5420 (Mainframes and
                 minicomputers)",
  classification = "713; 721",
  corpsource =   "IBM General Technol. Div., East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided design system; computers --- Circuits;
                 design optimization; design trade-offs; digital
                 computers; electrical; electrical design; high speed
                 computer; integrated circuits; LSI chip
                 interconnection; machine; packaging; packaging system;
                 performance",
  treatment =    "P Practical",
}

@Article{Fried:1982:VBM,
  author =       "L. J. Fried and J. Havas and J. S. Lechaton and J. S.
                 Logan and G. Paal and P. A. Totta",
  title =        "A {VLSI} Bipolar Metallization Design with Three-Level
                 Wiring and Area Array Solder Connections",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "362--371",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The ability to interconnect large numbers of
                 integrated silicon devices on a single chip has been
                 greatly aided by a three-level wiring capability and
                 large numbers of solderable input\slash output
                 terminals on the face of the chip. This paper describes
                 the design and process used to fabricate the
                 interconnections on IBM's most advanced bipolar
                 devices. Among the subjects discussed are thin film
                 metallurgy and contacts, e-beam lithography and
                 associated resist technology, a high temperature
                 lift-off stencil for metal pattern definition,
                 planarized RF sputtered SiO$_2$ insulation\slash
                 passivation, the ``zero-overlap'' via hole innovation,
                 in situ RF sputter cleaning of vias prior to
                 metallization, and area array solder terminals.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2550G (Lithography); B2570B (Bipolar integrated
                 circuits)",
  classification = "713; 721; 722",
  corpsource =   "IBM General Technol Div., East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "area array solder connections; beam lithography;
                 bipolar integrated circuits; cleaning; computers ---
                 Circuits; contacts; e-; electron beam; electron beam
                 lithography; high temperature lift-; in situ RF
                 sputter; input/output terminals; integrated circuit
                 technology; integrated circuits; large scale
                 integration; lithography; logic circuits; metal pattern
                 definition; metallisation; off stencil; passivation;
                 planarised RF; resist technology; Si integrated
                 circuits; solderable; sputtered SiO$_2$; thin film
                 metallurgy; three-level; VLSI bipolar metallization
                 design; wiring; zero overlap via hole",
  treatment =    "N New Development; P Practical",
}

@Article{Howard:1982:OIA,
  author =       "Robert T. Howard",
  title =        "Optimization of Indium-Lead Alloys for Controlled
                 Collapse Chip Connection Application",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "372--378",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents the results of development studies
                 leading to the use of a low-indium solder alloy for C-4
                 applications. This alloy overcomes all previous
                 concerns while exceeding the fatigue life specification
                 of the high-indium alloy. Also described are the
                 variables and tests used to evaluate C-4 performance of
                 In-Pb alloys over the 5\% to 50\% range. Results are
                 presented graphically and mathematically to show the
                 improvement obtained with indium-content solders over
                 the conventional tin-lead alloys.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2240 (Microassembly techniques)",
  classification = "721; 723",
  corpsource =   "IBM General Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "application; C-4 applications; computers; controlled
                 collapse chip connection; fatigue life; In-Pb alloys;
                 indium alloys; integrated circuit technology; lead
                 alloys; logic circuits; microassembling; solder alloy;
                 soldering; solders",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Getten:1982:IWS,
  author =       "J. R. Getten and R. C. Senger",
  title =        "Immersion Wave Soldering Process",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "3",
  pages =        "379--382",
  month =        may,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Immersion wave soldering is a new technique for
                 soldering advanced printed circuit boards. In this
                 process, an assembled and fixtured printed circuit
                 board is immersed in a fluxing fluid and preheated to
                 the soldering temperature. The fluxing fluid is
                 glycerine activated with ethylenediamine tetra-acetic
                 acid (EDTA). After preheating and while still immersed
                 in the fluxing fluid, the fixtured board is passed over
                 a tin-bismuth eutectic (42\% Sn, 58\% Bi) solder wave.
                 This technique has several advantages over conventional
                 soldering processes, including elimination of solder
                 dross formation, improved control over solder
                 deposition, reduced thermal shock, easier cleaning
                 after soldering, and improved flux effectiveness.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170G (General fabrication techniques); B2210D
                 (Printed circuit manufacture)",
  classification = "538; 703; 713",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electronic equipment manufacture; fluxing fluid;
                 glycerine; immersion wave soldering process; PCB;
                 printed circuit boards; printed circuits; Sn-Bi
                 eutectic solder; soldering; wave",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Agnew:1982:MIM,
  author =       "P. W. Agnew and A. S. Kellerman",
  title =        "Microprocessor Implementation of Mainframe Processors
                 by Means of Architecture Partitioning",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "401--412",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper examines several methods for applying LSI
                 and microprocessors to the design of processors of
                 increasing performance and complexity, and describes a
                 number of specific approaches to microprocessor-based
                 LSI implementation of System\slash 370 processors. The
                 most successful approaches partition the System\slash
                 370 instruction set into subsets, each of which can be
                 implemented by microcode on a special microprocessor or
                 by programs written for an off-the-shelf
                 microprocessor.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220 (Computer architecture)",
  classification = "713; 714; 721; 723",
  corpsource =   "IBM Corp., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture partitioning; computer architecture;
                 computer operating systems --- Program Processors;
                 computers, microprocessor; integrated circuits ---
                 Large Scale Integration; large scale integration; LSI;
                 mainframe; microcode; microprocessor chips; processors;
                 System/370",
}

@Article{Mintzer:1982:MSP,
  author =       "Fred Mintzer and Abraham Peled",
  title =        "A microprocessor for signal processing, the {RSP}",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "413--423",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The organization and architecture of the Real-Time
                 Signal Processor are described. Features of the RSP,
                 such as the instruction pipeline and the fractional
                 fixed-point arithmetic, which exploit the
                 characteristics of signal processing to provide
                 additional computational power, are emphasized. Other
                 features, such as the powerful indexing, the saturation
                 arithmetic, the guard bits, and the double-word-width
                 accumulator, which add much to the processor's
                 versatility and programmability, are also highlighted.
                 The performance of the RSP is illustrated through
                 examples.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5130 (Microprocessor chips); C5220 (Computer
                 architecture); C5260 (Digital signal processing)",
  classification = "721; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture; computer architecture; computer systems,
                 digital --- Real Time Operation; computerised signal
                 processing; computers, microprocessor; data processing;
                 double-word-width accumulator; fixed-point arithmetic;
                 fractional; guard bits; instruction pipeline;
                 microprocessor architecture; microprocessor chips;
                 organization; real-time signal processor; real-time
                 systems; saturation arithmetic",
  treatment =    "A Application; P Practical",
}

@Article{Cooley:1982:RTD,
  author =       "James W. Cooley",
  title =        "Rectangular Transforms for Digital Convolution on the
                 Research Signal Processor",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "424--430",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Convolution calculations by the RT method were
                 programmed for the Research Signal Processor (RSP) and
                 run on the RSP simulator, giving tabulations of numbers
                 of RSP machine cycles. One of the original objectives
                 was to see how well the original RSP architecture was
                 suited to the RCC algorithms and to be able to make
                 suggestions for possible changes. The results are also
                 intended to demonstrate the efficiency of the RT
                 convolution algorithms on a microprocessor with a
                 limited instruction set and to show how to construct
                 efficient RT programs for digital convolution.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5260 (Digital signal processing)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems --- Program Processors;
                 computer programming; computerised; computerised signal
                 processing; data processing; digital convolution;
                 processor; rectangular transform; reduced computational
                 complexity algorithms; research signal; signal
                 processing; transforms",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Davies:1982:RSP,
  author =       "Ken Davies and Fred Ris",
  title =        "Real-Time Signal Processor Software Support",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "431--439",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Real-Time Signal Processor (RSP) is a
                 microprocessor optimized to provide fast,
                 cost-efficient processing for signal processing
                 applications. In order for the RSP to become fully
                 useful, a complete set of software support tools needed
                 to be developed. The hardware design and software
                 development, which took place between 1978 and 1980,
                 resulted in many architectural features which minimized
                 hardware complexity at the expense of programmability.
                 This paper describes the tools that were developed and
                 the decisions that were involved, and includes
                 hindsight comments on what was done. Particular
                 emphasis is placed on the most interesting aspects of
                 the software development, i.e., how the special
                 architectural features of the RSP were handled to make
                 the overall hardware\slash software system more
                 programmable.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5260 (Digital signal processing); C6150 (Systems
                 software)",
  classification = "721; 722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer software; computer systems, digital --- Real
                 Time Operation; computerised signal processing;
                 computers, microprocessor; programmability; real-time;
                 signal processor; software development; software
                 support; systems software",
}

@Article{Dix:1982:CCU,
  author =       "G. L. Dix and M. D. Brown",
  title =        "Common Chip for Use in Disk and Diskette Controllers",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "440--445",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The advent of LSI technology makes common
                 microprogrammable controllers very cost-effective
                 today. This paper focuses on the application of
                 microcontrollers for disk and diskette control
                 functions and describes a custom-designed FET chip
                 which is being developed for use in these types of
                 controllers. The architecture, the functional
                 organization, and the physical design of this chip are
                 presented, and the requirement of matching a
                 microcontroller to the application is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570H
                 (Other field effect integrated circuits); C5320
                 (Digital storage); C7420 (Control engineering
                 computing)",
  classification = "721",
  corpsource =   "IBM Corp., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computerised control; computers, digital; controllers;
                 custom-designed FET chip; disk; diskette; field effect
                 integrated circuits; LSI; magnetic disc; magnetic disc
                 and drum storage; matching; microcontrollers;
                 microprocessor chips; microprogrammable controllers;
                 storage",
  treatment =    "A Application; P Practical",
}

@Article{Correale:1982:PDC,
  author =       "Anthony Correale",
  title =        "Physical Design of a Custom 16-bit Microprocessor",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "446--453",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The physical chip design aspects of a 16-bit,
                 single-chip, custom-macro-designed microprocessor are
                 described. This microprocessor represents the IBM
                 System Products Division's highest-density VLSI FET
                 processor design to date. The chip is a complex
                 arrangement of over 6500 VLSI circuits utilizing a
                 state-of-the-art polysilicon-gate HMOS-1
                 (high-performance MOS) technology. The physical design
                 of this chip required the use of a comprehensive
                 methodology, from conception through completion. The
                 methodology used in the design of the microprocessor
                 was based on a hierarchical approach and is presented
                 in this paper.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570F
                 (Other MOS integrated circuits); C5130 (Microprocessor
                 chips); C5210 (Logic design methods)",
  classification = "713; 714; 721; 723",
  corpsource =   "IBM Corp., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "16-; bit, single-chip, custom-macro-designed
                 microprocessor; computers, microprocessor; field effect
                 integrated circuits; hierarchical approach; IBM;
                 integrated circuits; large scale integration; logic
                 design; microprocessor chips; physical chip design;
                 polysilicon gate HMOS-1 technology; System Products;
                 VLSI/FET",
  treatment =    "P Practical",
}

@Article{Campbell:1982:DCV,
  author =       "John E. Campbell and Joseph Tahmoush",
  title =        "Design Considerations for a {VLSI} Microprocessor",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "454--463",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The 50-mm four-chip air-cooled microprocessor module
                 is packaged on a printed-circuit card with associated
                 repowering circuits and high-speed random-access
                 memory. Important design considerations and tradeoffs
                 associated with the development of this machine, within
                 specific cost, performance, reliability, and schedule
                 objectives, are discussed. Various processor design
                 techniques are described which minimize hardware where
                 performance is not critical. A degree of functional
                 parallelism is utilized, as well as timing flexibility,
                 to attain the required performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570B
                 (Bipolar integrated circuits); C5130 (Microprocessor
                 chips); C5210 (Logic design methods)",
  classification = "713; 714; 721; 723",
  corpsource =   "IBM Corp., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture; bipolar integrated circuits; bipolar
                 VLSI microprocessor; computers, microprocessor; design;
                 flexible; four-chip air-cooled microprocessor;
                 functional parallelism; integrated channel; integrated
                 circuits --- Very Large Scale Integration;
                 interrupt-driven; large scale integration; logic;
                 microprocessor chips; module; modules; storage
                 interface; timing flexibility; VLSI",
  treatment =    "P Practical",
}

@Article{Mathews:1982:BCD,
  author =       "K. F. Mathews and L. P. Lee",
  title =        "Bipolar Chip Design for a {VLSI} Microprocessor",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "464--474",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A pseudo-custom approach to bipolar VLSI chip design
                 is presented, and a hierarchical structure of logic
                 macros assembled from building blocks is described. A
                 strategy of placing the logic macros along with
                 algorithmically designed PLA structures and ROS with a
                 placement aid, and of wiring the placement with an
                 automatic wiring program, is discussed. The paper also
                 focuses on the implementation of this strategy in terms
                 of technology, chip structure, and chip design
                 methodology. In addition, chip statistics are presented
                 and their implications are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570B
                 (Bipolar integrated circuits); C5130 (Microprocessor
                 chips); C5210 (Logic design methods)",
  classification = "713; 714; 721; 723",
  corpsource =   "IBM Corp., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar integrated circuits; bipolar VLSI chip design;
                 chip statistics; chip structure; computers,
                 microprocessor; design; hierarchical structure of
                 logic; integrated circuits --- Very Large Scale
                 Integration; large scale integration; logic; logic
                 design; macros; microprocessor chips; pseudo-custom
                 design; technology; VLSI microprocessor",
  treatment =    "P Practical",
}

@Article{Tran:1982:VDV,
  author =       "Arnold S. Tran and Richard A. Forsberg and Jack C.
                 Lee",
  title =        "A {VLSI} design verification strategy",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "475--484",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The strategy discussed in this paper exploits the best
                 attributes of the two traditional methods of design
                 verification (i.e., software simulation and hardware
                 modeling). Software simulation was chosen for its
                 capability in the area of delay analysis and early
                 functional checking. An automatically generated
                 nodal-equivalent hardware model was built to provide
                 the vehicle on which exhaustive functional checking
                 could be performed. The model also operated as early
                 user hardware on which functions such as operating
                 systems, I/O adapters, and a floating-point feature
                 could be tested.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5130 (Microprocessor chips); C5210B (Computer-aided
                 logic design)",
  classification = "721; 723",
  corpsource =   "IBM Corp., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems --- Program Processors;
                 hardware; integrated circuits; interface emulation;
                 large scale integration; logic CAD; logic testing;
                 microprocessor chips; modelling; parallel debut;
                 software simulation; verification strategy; VLSI
                 design",
  treatment =    "P Practical",
}

@Article{McCabe:1982:BVC,
  author =       "J. F. McCabe and A. Z. Muszynski",
  title =        "Bipolar {VLSI} Custom Macro Physical Design
                 Verification Strategy",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "485--496",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a design verification strategy
                 and its implied constraints on chip design. The
                 rationale for comparing the logic equivalence of the
                 high-level logical models to the low-level-device
                 physical models is presented, a description of the
                 hierarchical logical-to-physical and electrical
                 checking is given, and its impact on cost and
                 complexity is examined.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570B
                 (Bipolar integrated circuits); C5130 (Microprocessor
                 chips); C5210B (Computer-aided logic design)",
  classification = "713; 714; 721; 723",
  corpsource =   "IBM Corp., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar integrated circuits; CAD; chips; complexity;
                 computers, microprocessor --- Design; cost; custom
                 bipolar VLSI; equivalence; high-level logical models;
                 integrated circuits; large scale integration; logic;
                 logic CAD; logic testing; low-level-device; macro;
                 microprocessor chips; physical and electrical design
                 validation; physical design verification strategy;
                 physical models",
  treatment =    "P Practical",
}

@Article{Mescia:1982:PAS,
  author =       "N. C. Mescia and C. D. Woods",
  title =        "Plant Automation in a Structured Distributed System
                 Environment",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "497--505",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper, the design and implementation of a
                 hierarchical distributed system for manufacturing
                 control of integrated electronic components are
                 described. The implementation includes distributed data
                 bases and inter-level decoupling to ensure 24-hour
                 manufacturing capabilities. Reasons for the choice of
                 the processors used at various levels in the
                 hierarchical network, and the communications required
                 between them, are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570 (Semiconductor integrated circuits); C3355
                 (Control applications in manufacturing processes);
                 C6150J (Operating systems); C7420 (Control engineering
                 computing)",
  classification = "713; 721; 723",
  corpsource =   "IBM Corp., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided manufacturing; control; data systems;
                 distributed data bases; distributed processing;
                 hierarchical distributed system; IBM; integrated
                 circuit; integrated circuit manufacture; integrated
                 circuits --- Very Large Scale Integration; inter-level
                 decoupling; large scale integration; logic devices;
                 manufacture; manufacturing; manufacturing computer
                 control; structured distributed system environment;
                 VLSI electronic components",
  treatment =    "A Application",
}

@Article{Franaszek:1982:CBD,
  author =       "P. A. Franaszek",
  title =        "Construction of Bounded Delay Codes for Discrete
                 Noiseless Channels",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "4",
  pages =        "506--514",
  month =        jul,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94B60",
  MRnumber =     "84g:94018",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "499.94020",
  abstract =     "Algorithms are described for constructing synchronous
                 (fixed rate) codes for discrete noiseless channels
                 where the constraints can be modeled by finite state
                 machines. The methods yield two classes of codes with
                 minimum delay or look-ahead.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bounded delay codes; codes; codes, symbolic; discrete;
                 finite state machines; minimum delay; minimum
                 look-ahead; noiseless channels; periodic; stationary
                 codes; synchronous fixed rate codes",
  reviewer =     "Ram Autar",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Carre:1982:SMT,
  author =       "H. Carre and R. H. Doxtator and M. C. Duffy",
  title =        "Semiconductor manufacturing technology at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "528--531",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B2550
                 (Semiconductor device technology); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM France, Corbeil-Essonnes, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automated logistics; crystals growth; dispositioning;
                 integrated circuit; integrated circuit manufacture;
                 large scale integration; quality control; semiconductor
                 manufacturing processes; technology; VLSI production",
  treatment =    "G General Review; P Practical",
}

@Article{Stapper:1982:EAV,
  author =       "C. H. Stapper and P. P. Castrucci and R. A. Maeder and
                 W. E. Rowe and R. A. Verheilst",
  title =        "Evolution and accomplishments of {VLSI} yield
                 management at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "532--545",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0140 (Administration and management); B0170L
                 (Inspection and quality control); B2570H (Other field
                 effect integrated circuits)",
  corpsource =   "General Technol. Div., IBM, Burlington Faculty, Essex
                 Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "64K-bit random access memory chip; circuits; electric
                 monitoring techniques; fault levels; FET semiconductor
                 products; field effect integrated circuits; inspection;
                 integration; large scale; long-range forecasting;
                 manufacturing lines; monitoring; partially functional
                 products; planning; redundant; self-checking; visual;
                 VLSI yield management; yield models",
  treatment =    "G General Review; P Practical",
}

@Article{Murgai:1982:OIP,
  author =       "A. Murgai and W. J. Patrick and J. Combronde and J. C.
                 Felix",
  title =        "Oxygen incorporation and precipitation in
                 {Czochralski-grown} silicon",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "546--552",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6475 (Solubility, segregation, and mixing); A8110F
                 (Crystal growth from melt); A8130M (Precipitation);
                 B0510 (Crystal growth); B2520C (Elemental
                 semiconductors); B2550 (Semiconductor device
                 technology)",
  corpsource =   "General Technol. Div., IBM, East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "annealing; crucible rotation; crystal growth from
                 melt; crystal-melt; Czochralski method; elemental
                 semiconductors; growth parameters; hot zones; interface
                 position; O incorporation; O precipitation;
                 precipitation; procedures; semiconductor growth; Si
                 crystal growth; silicon; unpopulated nucleation sites",
  treatment =    "X Experimental",
}

@Article{Rottmann:1982:MMM,
  author =       "H. R. Rottmann",
  title =        "Metrology in mask manufacturing (for {LSI})",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "553--556",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "General Technol. Div., IBM, East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "focus control; integrated circuit technology; large
                 scale integration; masks; microlithography; monolithic
                 integrated circuits; optical field sizes; optical
                 microscopy; registration failure; registration
                 stability; stepped-mask exposure systems",
  treatment =    "P Practical; X Experimental",
}

@Article{Frasch:1982:FSC,
  author =       "P. Frasch and K. H. Saremski",
  title =        "Feature size control in {IC} manufacturing ({LSI})",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "561--567",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Germany, Sindelfingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2-micron lithography ground rules; circuit-feature
                 dimensions; device density; dimensional; IC
                 manufacturing; integrated circuit manufacture; large
                 scale integration; LSI; manufacturing environment;
                 photolithography; variations",
  treatment =    "P Practical",
}

@Article{Bohlen:1982:EPP,
  author =       "H. Bohlen and J. Greschner and J. Keyser and W. Kulcke
                 and P. Nehmiz",
  title =        "Electron-beam proximity printing --- a new high-speed
                 lithography method for submicron structures",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "568--579",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Germany, Sindelfingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chip-size; electron beam lithography; electron-beam
                 proximity printer; exposure speed; high-speed
                 lithography; large scale integration; linewidth
                 resolution; LSI; masks; positional accuracy;
                 structures; submicron; transmission masks",
  treatment =    "N New Development; P Practical",
}

@Article{Bergendahl:1982:OPP,
  author =       "A. S. Bergendahl and S. F. Bergeron and D. L. Harmon",
  title =        "Optimization of plasma processing for silicon-gate
                 {FET} manufacturing applications",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "580--589",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550E (Surface treatment for semiconductor devices);
                 B2550G (Lithography); B2560S (Other field effect
                 devices)",
  corpsource =   "General Technol. Div., IBM, Burlington Facility, Essex
                 Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "anisotropic etching; experimentation; field effect
                 transistors; isotropic etching; optimisation;
                 photoresist; photoresists; plasma processing;
                 response-surface analysis techniques; semiconductor
                 technology; Si-gate FETs; sputter etching;
                 statistically designed multiparametric; stripping",
  treatment =    "A Application; P Practical",
}

@Article{Halverson:1982:MSL,
  author =       "R. M. Halverson and M. W. MacIntyre and W. T.
                 Motsiff",
  title =        "The mechanism of single-step liftoff with
                 chlorobenzene in a diazo-type resist",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "590--595",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "General Technol. Div., IBM, Burlington Facility, Essex
                 Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "casting; chlorobenzene single-step; diazo-type resist;
                 integrated circuit technology; integrated circuits;
                 liftoff process; metallisation; metallization;
                 monolithic; photoresists; resin species; resist film;
                 rinse cycle; soaking cycle; solvent",
  treatment =    "P Practical",
}

@Article{Collins:1982:PCC,
  author =       "G. G. Collins and C. W. Halsted",
  title =        "Process control of the chlorobenzene single-step
                 liftoff process with a diazo-type resist",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "596--604",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); C3350Z (Control applications in other
                 industries)",
  corpsource =   "IBM Japan Ltd., Shiga, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chlorobenzene single-step liftoff process;
                 chlorobenzene soaking; diazo-type; electron microscope;
                 integrated circuit technology; integrated circuits;
                 manufacturing lines; metallisation; monolithic;
                 photoresist liftoff image; photoresists;
                 post-application baking; process control; process
                 controls; resist; scanning; SEM photographs",
  treatment =    "A Application; P Practical",
}

@Article{Burgess:1982:SFT,
  author =       "R. M. Burgess and K. B. Koens and E. M. {Pignetti,
                 Jr.}",
  title =        "Semiconductor final test logistics and product
                 dispositioning systems",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "605--612",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B2570
                 (Semiconductor integrated circuits); B7210B (Automatic
                 test and measurement systems); C3350Z (Control
                 applications in other industries); C7410D (Electronic
                 engineering computing)",
  corpsource =   "General Technol. Div., IBM, East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic testing; batch processing (industrial);
                 bipolar; computerized tracking; final test logistics
                 system; integrated circuit testing; integrated
                 circuits; product dispositioning systems; production;
                 semiconductor line; semiconductor wafer; shippable
                 product batches; testing",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Melan:1982:QRA,
  author =       "E. H. Melan and R. T. Curtis and J. K. Ho and J. G.
                 Koens and G. A. Snyder",
  title =        "Quality and reliability assurance systems in {IBM}
                 semiconductor manufacturing",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "613--624",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170L (Inspection and quality control); B0170N
                 (Reliability)B2570 (Semiconductor integrated circuits);
                 C3350Z (Control applications in other industries)",
  corpsource =   "Data Systems Div., IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar logic manufacturing; control; feed-forward;
                 integrated circuit manufacture; large scale
                 integration; manufacturing; monolithic integrated
                 circuits; process control; process control techniques;
                 process profile; QC systems; quality; reliability;
                 reliability assurance systems; semiconductor;
                 technique; VLSI FET memory device line",
  treatment =    "A Application; P Practical",
}

@Article{Shedler:1982:RSN,
  author =       "Gerald S. Shedler and Jonathan Southard",
  title =        "Regenerative simulation of networks of queues with
                 general service times: {Passage} through subnetworks",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "5",
  pages =        "625--633",
  month =        sep,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K25 (62F25 68C15)",
  MRnumber =     "84f:60132",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "486.68018",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140C (Queueing theory); C4290 (Other computer
                 theory); C5420 (Mainframes and minicomputers)",
  corpsource =   "Res. Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "closed networks; confidence intervals; estimates;
                 general service times; generalized semi-Markov process;
                 irreducible; linear job stack; Markov processes;
                 method; multiprocessing systems; passage times; point;
                 queueing theory; regenerative simulation; state
                 vector",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wong:1982:DAS,
  author =       "K. Y. Wong and R. G. Casey and F. M. Wahl",
  title =        "{Document Analysis System}",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "647--656",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C7240 (Information analysis and indexing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "classification; clustering; computer; Document
                 Analysis System; encoding; font sizes; front styles;
                 information analysis; linear adaptive classification
                 scheme; pattern-matching method; processing;
                 run-length; segmentation; smoothing algorithm",
  treatment =    "P Practical",
}

@Article{Casey:1982:ASD,
  author =       "R. G. Casey and T. D. Friedman and K. Y. Wong",
  title =        "Automatic scaling of digital print fonts",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "657--666",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "contour smoothness; digital; dot matrices; fonts;
                 global symmetries; local symmetries; photocomposer;
                 print character quality; print fonts; printers;
                 printing; raster-based printers; scaling; stroke
                 width",
  treatment =    "A Application; P Practical",
}

@Article{Abdou:1982:ALI,
  author =       "I. E. Abdou and K. Y. Wong",
  title =        "Analysis of linear interpolation schemes for bi-level
                 image applications",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "667--680",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B0290F (Interpolation and function approximation);
                 B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition); C4130
                 (Interpolation and function approximation)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bi-level; coarse scan; fine print; image;
                 interpolation; linear interpolation schemes; picture
                 processing; polynomial functions; polynomials; pulse
                 functions; quantization effects; signal models; step
                 functions",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Brickman:1982:WAR,
  author =       "N. F. Brickman and W. S. Rosenbaum",
  title =        "{Word Autocorrelation Redundancy Match} ({WARM})
                 technology",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "681--686",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210H (Facsimile transmission); C7100 (Business and
                 administration)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "character level; complex symbol; correlation methods;
                 data compression; facsimile; facsimile technology;
                 image compression capability; intelligent; matching;
                 redundancy; textual documents; WARM; Word
                 Autocorrelation Redundancy Match; word level; word
                 processing",
  treatment =    "A Application; P Practical",
}

@Article{Anastassiou:1982:DHI,
  author =       "D. Anastassiou and K. S. Pennington",
  title =        "Digital halftoning of images",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "687--697",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bilevel images; clusters; contouring; digital gray
                 scale images; digital halftoning; edge enhancement;
                 halftoning algorithm; moire; parallel implementation;
                 parallel processing; patterns; picture processing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Danielsson:1982:ISC,
  author =       "P.-E. Danielsson",
  title =        "An improved segmentation and coding algorithm for
                 binary and nonbinary images",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "698--707",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "binary images; border following; coding; contour;
                 encoding; following; island; nonbinary images; object
                 following; picture processing; pixels; raster scanning;
                 segmentation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kriz:1982:RDR,
  author =       "T. A. Kriz",
  title =        "Reduced data re-order complexity properties of
                 polynomial transform {2D} convolution and {Fourier
                 Transform} methods",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "708--714",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition); C7410F
                 (Communications computing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2D Fourier; array processor units; computerised
                 picture processing; data processing; digital
                 processing; execution time; Fourier transforms; image
                 processing; matrix data reorder requirements; modified
                 ring polynomial transform methods;
                 polynomial-transform-based 2D convolution; polynomials;
                 power-of-2 length-; structures; Transform methods",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dave:1982:IHC,
  author =       "J. V. Dave and R. Bernstein and H. G. Kolsky",
  title =        "Importance of higher-order components to multispectral
                 classification (Landsat image data)",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "715--723",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B6140C
                 (Optical information, image and video signal
                 processing); B7710 (Geophysical techniques and
                 equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "classification; color composites; digital terrain
                 elevation data; dimensionality; geophysical techniques;
                 information extraction; Landsat multispectral image;
                 multispectral classification; picture processing;
                 procedures; remote sensing",
  treatment =    "A Application; X Experimental",
}

@Article{Jimenez:1982:SEI,
  author =       "J. Jimenez and J. L. Navalon",
  title =        "Some experiments in image vectorization",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "724--734",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6140C (Optical information, image and
                 video signal processing); C1250 (Pattern recognition)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cartography; contour following; digital images;
                 encoding; line thinning; Map Manipulation; picture
                 processing; polygonal approximation; System;
                 vectorization algorithms",
  treatment =    "X Experimental",
}

@Article{Montoto:1982:DMA,
  author =       "L. Montoto",
  title =        "Digital multi-image analysis: application to the
                 quantification of rock microfractography",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "735--734",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A9160B (Mechanical and acoustic properties of rocks,
                 minerals and soil); A9385 (Instrumentation and
                 techniques for geophysical, hydrospheric and lower
                 atmosphere research)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "crack detection; digital multiimage analysis;
                 fluorescence; geology; microcrack types;
                 microfissuration; micrographs; microscopy; picture
                 processing; polarizing; rock microfractography; rocks",
  treatment =    "A Application; X Experimental",
}

@Article{Farrell:1982:BAI,
  author =       "E. J. Farrell",
  title =        "Backscatter and attenuation imaging from ultrasonic
                 scanning in medicine",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "746--758",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A8760B (Sonic and ultrasonic radiation (medical
                 uses)); A8770E (Patient diagnostic methods and
                 instrumentation); B7510B (Radiation and radioactivity
                 applications in biomedicine)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "attenuation imaging; backscatter; beamwidth;
                 biomedical ultrasonics; cross-coupling artifacts;
                 distortion; image; image iteration; medicine; patient
                 diagnosis; reconstruction; simulated echo data;
                 speckle; three-parameter model; ultrasonic scanning",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Barnes:1982:ASP,
  author =       "E. R. Barnes",
  title =        "An algorithm for separating patterns by ellipsoids",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "759--764",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90C05",
  MRnumber =     "84f:90050",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "504.68058",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ellipsoids; feature space; finite-dimensional
                 Euclidean; pattern recognition; pattern separation;
                 space",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Tappert:1982:CSR,
  author =       "C. C. Tappert",
  title =        "Cursive script recognition by elastic matching",
  journal =      j-IBM-JRD,
  volume =       "26",
  number =       "6",
  pages =        "765--771",
  month =        nov,
  year =         "1982",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1180 (Optimisation techniques); C1250
                 (Pattern recognition); C5530 (Pattern recognition and
                 computer vision equipment)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "coordinate data; cursive script; dynamic programming;
                 elastic matching; electronic tablet; letter
                 recognition; letter segmentation; letter sequence;
                 nonlinear time warping; pattern recognition;
                 recognition; technique; time sequences; x-y",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical",
}

@Article{Cleverley:1983:PQL,
  author =       "Donald S. Cleverley",
  title =        "Product Quality Level Monitoring and Control for Logic
                 Chips and Modules",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "4--10",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper defines an absolute number for product
                 defects, called ``product quality level'' (PQL). PQL
                 categories found in logic chips and modules after
                 completion of electrical testing are described and a
                 methodology for the monitoring and control of the PQL
                 in chips is presented. The impact of chip defects on
                 module, card, and system performances is discussed with
                 the aid of examples. By using the described
                 comprehensive design, process control, testing, and
                 user-feedback approach at each assembly level, final
                 product can be manufactured with the lowest possible
                 level of defects that must then be repaired at the
                 machine level.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170L (Inspection and quality control); B1265B (Logic
                 circuits)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "controls; inspection; integrated logic circuits; level
                 of defects; logic chips; logic design; logic modules;
                 logic testing; manufacturing process; modules;
                 monitoring; PQL categories; product assembly; product
                 reliability; quality control; quality levels",
  treatment =    "P Practical",
}

@Article{Burger:1983:MCM,
  author =       "William G. Burger and Charles W. Weigel",
  title =        "Multi-Layer Ceramics Manufacturing",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "11--19",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Multi-layer ceramics (MLC) is an advanced packaging
                 technology developed by IBM and used in the IBM 4300
                 and IBM 3081 processor models to significantly improve
                 the module circuit density, reliability, and
                 performance over those of previous packages. A key
                 element in this package is the MLC substrate, which is
                 capable of supporting more than 100 semiconductor chips
                 in some design uses. The MLC manufacturing facility
                 requires that sophisticated processing and
                 inspection\slash test equipment operate within a
                 hierarchically integrated system. This paper provides
                 an overview of the manufacturing process that has been
                 implemented to satisfy the high-volume manufacturing
                 needs of this complex package. It also describes the
                 data handling systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B0540 (Ceramics and
                 refractories (engineering materials science))",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081; ceramics; IBM; IBM 4300; inspection/test
                 equipment; integrated circuit manufacture; MLC
                 substrate; module circuit density; modules; multilayer
                 ceramics; packaging; packaging technology;
                 reliability",
  treatment =    "A Application; P Practical",
}

@Article{Sanborn:1983:PNC,
  author =       "Malcolm A. Sanborn",
  title =        "Precise Numerical Control for the Thermal Conduction
                 Module",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "20--26",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Automated manufacturing processes have been developed
                 and put into practice for the high-volume production of
                 the thermal conduction module, the high-density circuit
                 package used in the IBM 3081 processor models. The very
                 precise work required on the ceramic surface required
                 the solution of many problems. The small but
                 significant residual distortions (warpage) which
                 resulted from firing the multi-layer ceramic substrates
                 made it difficult to locate tooling precisely for
                 subsequent processes. A unique scheme for measuring the
                 module and precalculating numerical control data has
                 made it possible to achieve full automation. The nature
                 of the problem, the attempts at a simple solution, and
                 the algorithms finally used for numerical control data
                 calculation are presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); C3355 (Control
                 applications in manufacturing processes); C7410D
                 (Electronic engineering computing); C7420 (Control
                 engineering computing)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated manufacturing processes; computerised
                 numerical control; control; high-density circuit;
                 high-volume production; IBM 3081 processor models;
                 integrated circuit manufacture; manufacturing computer;
                 module; modules; numerical control data; package;
                 packaging; thermal conduction; tooling; warpage",
  treatment =    "P Practical",
}

@Article{Curtin:1983:MMT,
  author =       "James J. Curtin and John A. Waicukauski",
  title =        "Multi-Chip Module Test and Diagnostic Methodology",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "27--34",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The development of a manufacturing test and diagnostic
                 methodology for multi-chip modules as used in the IBM
                 4300 processor models involves determining the most
                 attractive compromise among a number of conflicting
                 factors: (a) high test coverage; (b) high diagnostic
                 resolution, (c) test generation, (d) test equipment,
                 and (e) test application and diagnosis. This paper
                 describes a set of solutions which were developed to
                 create a high-volume, low-cost manufacturing test
                 operation for the product in question. This paper
                 examines the role of the testing methodology in
                 productivity and product quality, details the
                 diagnostic approach chosen, and provides an example of
                 the overall manufacturing system performance achieved
                 by analyzing a large module production sample.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B0170L
                 (Inspection and quality control); B2210D (Printed
                 circuit manufacture)",
  classification = "713; 721; 722; 723",
  corpsource =   "IMB General Technol. Div., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "diagnostic methodology; electronic equipment testing;
                 equipment; IBM 4300 processor models; integrated
                 circuit testing; manufacturing; modules; multichip
                 modules; printed circuits; product; production testing;
                 productivity; quality; quality control; test; test
                 generation; testing methodology",
  treatment =    "P Practical",
}

@Article{Pierson:1983:LTT,
  author =       "Roland L. Pierson and Thomas B. Williams",
  title =        "{LT1280} for Through-The-Pins Testing of the Thermal
                 Conduction Module",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "35--40",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Testing the thermal conduction module (TCM), the
                 high-density field-replaceable unit (FRU) used in the
                 IBM 3081 processor models, and diagnosing the faults
                 encountered to a minimal repairable set of entities
                 posed a new problem for the IBM engineers. The
                 requirement and the economic necessity of thoroughly
                 exercising the entire TCM logic and random access
                 memory (RAM) array structure through the input\slash
                 output pins of the TCM are discussed. This is followed
                 by a description of the test system alternatives and
                 the LT1280 left bracket logic tester having 1280
                 input\slash output (I/O) pins right bracket as the
                 selected TCM manufacturing test system. The TCM logic
                 density and high I/O count required new concepts of
                 test system organization, size, and complexity to
                 achieve a test and diagnostic system with high
                 flexibility and high throughput capability.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B0170L (Inspection and
                 quality control); B1265 (Digital electronics); B7210B
                 (Automatic test and measurement systems)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 processor models; automatic test equipment;
                 cellular arrays; conduction module; density;
                 high-density field-replaceable unit; IBM; input/output;
                 integrated circuit testing; logic; logic array; logic
                 tester; logic testing; LT1280; manufacturing test
                 system; minimal repairable set; modules; packaging;
                 pins; RAM array; thermal; through-the-pins testing",
  treatment =    "A Application; P Practical",
}

@Article{Barry:1983:FDL,
  author =       "Patricia Latus Barry",
  title =        "Failure Diagnosis on the {LT1280}",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "41--49",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The high-density circuitry and I/O pin population of
                 the thermal conduction module (TCM), the VLSI package
                 used in the IBM 3081 processor models, dictates that
                 there be a precise and cost-effective method of
                 detecting and diagnosing TCM defects. This paper
                 describes the challenge faced in testing the logic and
                 random access memories of the TCM and the diagnostic
                 approach used in the LT1280 test system for testing the
                 TCM through its I/O pins. The generation and
                 application of tests are discussed, and the automated
                 multiple-defect diagnostic (AMDD) algorithm is
                 presented in detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B1265 (Digital electronics);
                 B7210B (Automatic test and measurement systems)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 processor models; automated; automatic test
                 equipment; cellular arrays; failure analysis;
                 high-density circuitry; I/O pin; IBM; integrated
                 circuit testing; large scale integration; logic
                 testing; LT1280 test system; multiple-defect
                 diagnostic; population; RAM arrays; random-access;
                 storage; thermal conduction module; VLSI package",
  treatment =    "P Practical",
}

@Article{Baldwin:1983:CCO,
  author =       "Edwin C. Baldwin and Steven M. DeFoster and Mark A.
                 West and Richard A. Ziegler",
  title =        "Computer-Controlled Optical Testing of High-Density
                 Printed-Circuit Boards",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "50--58",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The increased densities of multi-layer printed-circuit
                 boards have required development of unique approaches
                 to product testing. An optical automatic inspection
                 system developed to test interplanes of the
                 printed-circuit board used in the IBM 3081 processor
                 (TCM board) is described. This system scans the
                 features of the product and locates surface defects of
                 25.4 $\mu$ m (1 mil) or larger through changes in
                 reflectivity. It is capable of finding over 90\% of the
                 errors on subtractively plated printed-circuit
                 interplanes, as well as shorts and opens of 50 $\mu$ m
                 or more on glass masters of printed-circuit boards.
                 Alternative approaches to the inspection problem are
                 discussed, together with the technical trade-offs which
                 were made that led to the final system configuration.
                 The tester theory and some hardware\slash software
                 trade-offs are also covered.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170L (Inspection and quality control); B2210D
                 (Printed circuit manufacture); B7210B (Automatic test
                 and measurement systems)",
  classification = "703; 713; 721; 722; 723",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated inspection system; automatic test equipment;
                 computer-controlled optical testing; density
                 printed-circuit boards; final; high-; IBM 3081
                 processor; inspection; integrated circuit testing ---
                 Automatic Testing; interplanes; multilayer PCBs;
                 nondestructive; printed circuits; production testing;
                 surface defects; system configuration; testing",
  treatment =    "A Application; P Practical",
  xxauthor =     "M. A. West and S. M. DeFoster and E. C. Baldwin and R.
                 A. Ziegler",
}

@Article{Dooley:1983:MPA,
  author =       "Brian J. Dooley",
  title =        "Model for the Prediction of Assembly, Rework, and Test
                 Yields",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "59--67",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A simulation model based on the concepts described in
                 this paper was implemented as a means for studying the
                 behavior of different assembly\slash test methodologies
                 and to predict the throughput capabilities of various
                 manufacturing configurations. By adopting a different
                 simulation philosophy, the model was greatly
                 simplified, and by taking advantage of the matrix
                 processing features of APL, modeling changes required
                 due to procedure or test-equipment changes could easily
                 be implemented. This paper reviews the philosophy of
                 the simulation of computer part assembly, takes a new
                 look at modeling, and describes the architectural
                 concepts embodied in the implementing program. It also
                 details some of the more important concepts needed to
                 complete the simulator.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7160 (Manufacturing and industrial administration);
                 C7430 (Computer engineering)",
  classification = "713; 721; 722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3081 processors; APL; assembly; assembly/test
                 methodologies; computer testing; digital simulation; DP
                 industry; features; field-replaceable units; IBM;
                 integrated circuits; manufacturing data processing;
                 manufacturing planning effort; matrix processing;
                 model; rework; simulation; test yields",
  treatment =    "P Practical",
}

@Article{Smith:1983:TNA,
  author =       "F. D. Smith and C. H. West",
  title =        "Technologies for Network Architecture and
                 Implementation",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "1",
  pages =        "68--78",
  month =        jan,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses some of the fundamental
                 properties of network architectures such as SNA, and
                 the evolution of formal descriptive methods that
                 provide precise, complete definitions of the
                 architecture. This has culminated in the development of
                 a programming language, Format and Protocol Language
                 (FAPL), tailored for programming a reference model or
                 metaimplementation of an SNA node. In this form, the
                 architecture specifications is itself
                 machine-executable.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques); C6140E (Other programming
                 languages)",
  classification = "723",
  corpsource =   "IBM Communication Products Div., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer networks; distributed processing; distributed
                 processors; FAPL; Format and Protocol Language;
                 languages; meta-implementation; network software;
                 programming; programming language; protocol validation;
                 protocols; reference model; software technologies;
                 Systems Network Architecture",
  treatment =    "P Practical",
}

@Article{Martin:1983:ACC,
  author =       "G. Nigel N. Martin and Glen G. {Langdon, Jr.} and
                 Stephen J. P. Todd",
  title =        "Arithmetic Codes for Constrained Channels",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "94--106",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "528.94012",
  abstract =     "Arithmetic codes have been studied in the context of
                 compression coding, i.e., transformations to code
                 strings which take up less storage space or require
                 less transmission time over a communications link.
                 Another application of coding theory is that of
                 noiseless channel coding, where constraints on strings
                 in the channel symbol alphabet prevent an obvious
                 mapping of data strings to channel strings. An
                 interesting duality exists between compression coding
                 and channel coding. The source alphabet and code
                 alphabet of a compression system correspond,
                 respectively, to the channel alphabet and data alphabet
                 of a constrained channel system. The decodability
                 criterion of compression codes corresponds to the
                 representability criterion of constrained channel
                 codes, as the generalized Kraft Inequality has a dual
                 inequality due to the senior author.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  classification = "723; 731",
  corpsource =   "IBM UK Labs. Ltd., Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arithmetic codes; channel alphabet; channel symbol
                 alphabet; code alphabet; codes; codes, symbolic; coding
                 theory; communication channels; communications link;
                 compression coding; constrained channels; criterion;
                 data alphabet; data compression; decodability;
                 information theory --- Channel Capacity; source
                 alphabet; storage space; transmission time",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Todd:1983:GFR,
  author =       "Stephen J. P. Todd and Glen G. {Langdon, Jr.} and G.
                 Nigel N. Martin",
  title =        "A general fixed rate arithmetic coding method for
                 constrained channels",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "107--115",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "528.94013",
  acknowledgement = ack-nhfb,
  classcodes =   "B6110 (Information theory); B6120B (Codes); C1260
                 (Information theory)",
  corpsource =   "IBM UK Sci. Centre, Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "codes; communication channels; constrained channels;
                 encoding; general fixed rate arithmetic coding",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Franchi:1983:DIA,
  author =       "Paolo Franchi and Jorge Gonzalez and Patrick Mantey
                 and Carlo Paoli and Albertao Parolo and John Simmons",
  title =        "Design Issues and Architecture of Hacienda, an
                 Experimental Image Processing System",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "116--126",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper provides the rationale for the architecture
                 and design of a color image display and processing
                 system called HACIENDA. The system was heavily
                 influenced by one of its most important intended
                 applications, the processing of LANDSAT data, including
                 that to be provided by LANDSAT D. Also considered in
                 the paper are the trade-offs involved in making the
                 system suitable for a broader range of image processing
                 work without unduly adding to cost or complexity.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); B7260 (Display technology and systems);
                 C5260 (Digital signal processing)",
  classification = "723; 741",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architecture; colour image display system;
                 computerised picture processing; design; display
                 instrumentation; HACIENDA; image processing; LANDSAT D;
                 LANDSAT data; system",
  treatment =    "P Practical; X Experimental",
}

@Article{Santisteban:1983:PCS,
  author =       "Antonio Santisteban",
  title =        "Perceptual Color Space of Digital Image Display
                 Terminals",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "127--132",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The geometric properties of the set of colors that can
                 be displayed on the TV monitor of a digital image
                 processing terminal are discussed in the framework of
                 the Commission Internationale de l'Eclairage (CIE) 1976
                 (L*u*v*) color space. Quantitative results are
                 presented for the HACIENDA image processing system. The
                 use of lightness, chroma, and hue angle for the
                 representation of multi-band images is briefly
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); B7260 (Display technology and systems)",
  classification = "723; 741",
  corpsource =   "Centro Cientifico, IBM, Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chroma; computerised picture processing; digital image
                 display terminals; display devices; geometric
                 properties; HACIENDA image processing; image
                 processing; interactive terminals; lightness;
                 perceptual color space; system; TV monitor",
  treatment =    "P Practical",
}

@Article{Fagin:1983:FCS,
  author =       "Ronald Fagin and John Hayden Williams",
  title =        "A fair carpool scheduling algorithm",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "133--139",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Authors present a simple carpool scheduling algorithm
                 in which no penalty is assessed to a carpool member who
                 does not ride on any given day. The algorithm is shown
                 to be fair, in a certain reasonable sense. The amount
                 of bookkeeping grows only linearly with the number of
                 carpool members.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1290H (Systems theory applications in
                 transportation)",
  classification = "913; 921",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bookkeeping; fair carpool scheduling algorithm;
                 scheduling; transportation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Miranker:1983:ZTV,
  author =       "Glen S. Miranker and Luong Tang and Chak Kuen Wong",
  title =        "``Zero-Time'' {VLSI} Sorter",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "140--148",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A hardware sorter suitable for VLSI implementation is
                 proposed. It operates in a parallel and pipelined
                 fashion, with the actual sorting time absorbed by the
                 input\slash output time. A detailed VLSI implementation
                 is described which has a very favorable device count
                 compared to existing static RAM.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5150 (Other circuits for digital computers); C6130
                 (Data handling techniques)",
  classification = "713; 723",
  corpsource =   "Valid Logic Systems Inc., Sunnyvale, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data processing; hardware sorter; integrated circuits,
                 VLSI; large scale integration; logic design; parallel
                 processing; pipeline; pipeline processing; processing;
                 sorting; static RAM; zero-time VLSI sorter",
  treatment =    "P Practical",
}

@Article{Koppelman:1983:OSI,
  author =       "George M. Koppelman and Michael A. Wesley",
  title =        "{Oyster}: a Study of Integrated Circuits as
                 Three-Dimensional Structures",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "149--163",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a design for a software system
                 (OYSTER) for the parametric simulation and analysis of
                 the fabrication steps of very large scale integrated
                 circuit devices. The system is based on a solid
                 geometric modeling approach in which the component
                 parts of an integrated circuit are represented at any
                 step as three-dimensional solid objects in a geometric
                 data base. The simulation of a fabrication step
                 transforms the data base representation of the geometry
                 and the relations among component parts from their
                 state before the step to their state after the step. At
                 any step, and particularly after the final step, the
                 component parts may be analyzed automatically to
                 determine geometric, mechanical, thermal, and
                 electrical properties.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); C7410D (Electronic engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit analysis computing; device; electrical
                 properties; FET; integrated circuit manufacture;
                 integrated circuits; large scale integration;
                 mechanical properties; modeling approach; OYSTER;
                 parametric simulation; planar masks; software system;
                 solid geometric; thermal properties; three-dimensional
                 structures; VLSI devices",
  treatment =    "P Practical",
}

@Article{Voldman:1983:FNS,
  author =       "Jean Voldman and Benoit Mandelbrot and Lee W. Hoevel
                 and Joshua Knight and Philip L. Rosenfeld",
  title =        "Fractal Nature of Software-Cache Interaction",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "164--170",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper uses fractals to model the clustering of
                 cache misses. The clustering of cache misses can be
                 quantified by a single number analog to a fractional
                 dimension, and we are intrigued by the possibility that
                 this number can be used as a measure of software
                 complexity. The essential intuition is that cache
                 misses are a direct reflection of changes in locality
                 of reference, and that complex software requires more
                 frequent (and larger) changes in this locality than
                 simple software. The cluster dimension provides a
                 measure (and perhaps the basis for a model) of the
                 intrinsic differences between workloads. This paper
                 focus on cache miss activity as a discriminate between
                 interactive and batch environments.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory)",
  classification = "723",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "batch environments; clustering; computational
                 complexity; computer software; fractal nature;
                 interactive environments; modelling; software
                 complexity; software-cache interaction",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Bugdayci:1983:AMR,
  author =       "Nur Bugdayci and David B. Bogy and Frank E. Talke",
  title =        "Axisymmetric Motion of Radially Polarized
                 Piezoelectric Cylinders Used in Ink Jet Printing",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "171--180",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An analysis of the low frequency response of
                 piezoelectric squeeze tubes used in drop-on-demand ink
                 jet printing is carried out. The displacements at inner
                 and outer boundaries are determined as a function of
                 voltage and fluid pressure. The results are used to
                 obtain fluid pressure per applied voltage as a function
                 of inner and outer radius. Numerical computations are
                 carried out for PZT-5H, and results are presented in
                 graphical form which can be used to optimize design
                 dimensions. The effect of finite electrode thickness is
                 also studied.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2860 (Piezoelectric and ferroelectric devices)",
  classification = "714; 745",
  corpsource =   "Univ. of California, Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "axisymmetric motion; electrode thickness; finite;
                 fluid pressure; ink jet printing; numerical
                 computations; piezoelectric devices; piezoelectric
                 squeeze tubes; polarized piezoelectric cylinders;
                 printers; printing; PZT-5H; radially",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Lew:1983:IRC,
  author =       "John S. Lew",
  title =        "Improved Regional Correlation Algorithm for Signature
                 Verification Which Permits Small Speed Changes Between
                 Handwriting Segments",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "2",
  pages =        "181--185",
  month =        mar,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The presently used intersegment distance permits
                 certain natural data transformations. A new
                 intersegment distance is proposed which permits further
                 natural transformations: translating a segment by a
                 fraction of the sampling interval; and writing at
                 slightly different uniform speed within each segment.
                 The new distance, like the old one, is the minimum of a
                 certain function. An algorithm is described which
                 computes this minimum.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); B6140C
                 (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acceleration components; accelerometers; character
                 recognition; data transformations; handwriting
                 segments; orthogonal; pattern recognition; pen axis;
                 regional correlation algorithm; signal processing;
                 signature verification",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Padegs:1983:SEA,
  author =       "Andris Padegs",
  title =        "{System\slash 370} Extended Architecture: Design
                 Considerations",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "198--205",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A review is given of the overall objectives and the
                 design considerations that led to the System\slash 370
                 Extended Architecture (370-XA). It presents an overview
                 of the differences between the System\slash 370 and
                 370-XA architectures and summarizes all architectural
                 extensions, deletions, and changes. Then it describes
                 in more detail the extensions for interpretive
                 execution, 31-bit addressing, protection, tracing,
                 inter-CPU communications, and extended-precision
                 floating-point division. Refs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture)",
  classification = "722; 723",
  corpsource =   "Information Systems and Technol. Group, IBM,
                 Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "31-bit addressing; computer architecture;
                 considerations; design; extended-precision;
                 floating-point division; inter-CPU communications;
                 interpretive execution; multiple virtual storage;
                 operating systems; operating systems (computers);
                 protection; System/370 architecture; System/370
                 Extended Architecture; System/370 extended architecture
                 (370-XA); tracing; virtual storage",
  treatment =    "N New Development; P Practical",
}

@Article{Cormier:1983:SEA,
  author =       "R. L. Cormier and Robert J. Dugan and Richard R.
                 Guyette",
  title =        "{System\slash 370} Extended Architecture: the Channel
                 Subsystem",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "206--218",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "THE 370-XA channel subsystem architecture represents a
                 significant extension of the corresponding System\slash
                 370 architecture. This paper examines the need for
                 these extensions, discusses the important features and
                 facilities of the new architecture, and provides
                 comparisons with its predecessor, the System\slash 370
                 channel architecture. It also describes, from an
                 operational viewpoint, how these new concepts affect
                 I/O processing and how they relate to the current trend
                 toward using multiple CPUs, increasing CPU execution
                 speed, and increasing the number of I/O attachments.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture)",
  classification = "722; 723",
  corpsource =   "Information Systems and Technol. Group, IBM,
                 Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "channel subsystem; computer architecture; I/O;
                 multiple CPUs; processing; System/370 architecture;
                 System/370 Extended Architecture; System/370 extended
                 architecture (370-XA)",
  treatment =    "N New Development; P Practical",
}

@Article{Comfort:1983:FSA,
  author =       "Webb T. Comfort",
  title =        "Fault-Tolerant System Architecture for {Navy}
                 Applications",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "219--236",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A description is given of the architecture of a
                 computer system, being designed and built for the U. S.
                 Navy, that is expected to be the standard Navy
                 shipboard computer for the next twenty years or so. It
                 has a requirement for very high system reliability,
                 which is addressed by a multiprocessor system
                 configuration that can recover dynamically from
                 hardware faults and support on-line repair of failed
                 hardware elements. The overall system architecture and
                 a number of significant new features designed to
                 support fault-tolerant operation are discussed,
                 including a duplex control bus, a computer
                 interconnection system, a technique for remote
                 diagnostics, a single-button maintenance procedure, and
                 special fault-handling software.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); C5220
                 (Computer architecture); C5420 (Mainframes and
                 minicomputers)",
  classification = "404; 672; 722; 723",
  corpsource =   "Federal Systems Div., IBM, Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AN/UYK-43; application programs; computer; computer
                 architecture; computer interconnection system; computer
                 programming; computers, microprocessor; duplex control
                 bus; fault tolerant computing; fault-handling software;
                 fault-tolerant system architecture; interconnection
                 system; maintenance procedure; military equipment;
                 multiprocessor system; naval vessels; navy
                 applications; Navy shipboard computer; on-line repair;
                 reliability; remote diagnostics; single-button;
                 single-button maintenance procedure; system",
  treatment =    "A Application; P Practical",
}

@Article{Radin:1983:M,
  author =       "George Radin",
  title =        "The 801 Minicomputer",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "237--246",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An overview is provided of an experimental system
                 developed at the IBM Thomas J. Watson Research Center.
                 It consists of a running hardware prototype, a control
                 program, and an optimizing compiler. The basic concepts
                 underlying the system are discussed, as are the
                 performance characteristics of the prototype. In
                 particular, three principles are examined: (1) system
                 orientation towards the pervasive use of high-level
                 language programming and a sophisticated compiler, (2)
                 a primitive instruction set which can be completely
                 hard-wired, and (3) storage hierarchy and I/O
                 organization to enable the CPU to execute an
                 instruction at almost every cycle.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); C5420
                 (Mainframes and minicomputers)",
  classification = "722; 723",
  corpsource =   "System Products Div., IBM, White Plains, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "801 minicomputer; compiler; computer architecture;
                 computer programming; computers, miniature; control
                 program; hardware prototype; high-level; I/O
                 organization; IBM 801 minicomputer; instruction set;
                 language programming; minicomputers; optimizing
                 compiler; performance characteristics; storage
                 hierarchy",
  treatment =    "P Practical",
}

@Article{Rao:1983:IMO,
  author =       "Gururaj S. Rao and Philip L. Rowenfeld",
  title =        "Integration of Machine Organization and Control
                 Program Design --- Review and Direction",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "247--256",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A discussion is given of the relationship between
                 machine organization and control program design in
                 high-end commercial computer systems. The criterion is
                 cost\slash performance subject to achieving an
                 acceptable performance level. A brief discussion of the
                 environment expected for the design and operation of
                 high-end commercial computer systems is outlined,
                 followed by a discussion of machine organization
                 techniques, which are classified and reviewed to permit
                 a qualitative evaluation of the degree to which control
                 program intent is exploited in machine organization.
                 The thesis is developed next, by using a hierarchical
                 model which illustrates the contention, that
                 architecture has acted as a barrier to communication
                 between the control program and machine organization.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture)",
  classification = "723",
  corpsource =   "Data Systems Div., IBM, White Plains, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; computer systems programming;
                 control program; control program design;
                 cost/performance; hierarchical model; high-end
                 commercial computer systems; machine organisation
                 integration; machine organization; memory hierarchy;
                 qualitative evaluation",
  treatment =    "P Practical",
}

@Article{Wright:1983:DCA,
  author =       "Robert E. Wright",
  title =        "Documenting a Computer Architecture",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "257--264",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The documentation of a computer architecture requires
                 that special conditions be satisfied in its preparation
                 to ensure exactness, consistency, and completeness. One
                 group in IBM, Central Systems Architecture, has spent
                 many years refining procedures for producing quality
                 documentation of this type, most notably for the
                 System\slash 370 architecture and the System\slash 370
                 Extended Architecture (370-XA). The steps this group
                 performs in documenting a computer architecture, the
                 requirements identified for the finished description,
                 and the procedures followed to satisfy those
                 requirements are described.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C6110 (Systems analysis
                 and programming)",
  classification = "722; 723",
  corpsource =   "Information Systems and Technol. Group, IBM,
                 Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "completeness; computer architecture; consistency;
                 documentation; exactness; program and system
                 documentation; System/370 architecture; System/370
                 Extended Architecture; System/370 extended architecture
                 (370-XA)",
  treatment =    "P Practical",
}

@Article{Eichelberger:1983:RCE,
  author =       "Edward B. Eichelberger and Eric Lindbloom",
  title =        "Random-Pattern Coverage Enhancement and Diagnosis for
                 {LSSD} Logic Self-Test",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "265--272",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Embedded linear feedback shift registers can be used
                 for a logic component self-test. The issue of test
                 coverage is addressed by circuit modification, where
                 necessary, of random-pattern-resistant fault nodes.
                 Also given is a procedure that supports net-level
                 diagnosis for structured logic in the presence of
                 random test-pattern generation and signature
                 analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); C5210 (Logic design
                 methods)",
  classification = "721",
  corpsource =   "Data Systems Div., IBM, Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "diagnosis; embedded linear feedback shift registers;
                 level diagnosis; level-sensitive scan design; linear
                 feedback shift registers; logic circuits; logic design;
                 logic self-test; logic testing; LSSD logic self-test;
                 net-; programmable logic array; random test-pattern
                 coverage; random-pattern coverage enhancement;
                 signature analysis; structured logic",
  treatment =    "P Practical; X Experimental",
}

@Article{Hendriks:1983:BCM,
  author =       "Ferdinand Hendriks",
  title =        "Bounce and Chaotic Motion in Impact Print Hammers",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "273--280",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A lumped-parameter description is given of an impact
                 printer actuator of the stored-energy type. All
                 constants necessary to describe the actuator and the
                 ribbon\slash paper pack are derived from measurements.
                 The equations of motion are integrated both for
                 single-and multiple-current pulse excitation. The
                 numerical results show that for low repetition rates,
                 each impact is distinct and independent, but at higher
                 rates the impacts interact.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 921",
  corpsource =   "General Products Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bounce; computer peripheral equipment; cycle times;
                 flight-time; impact print hammers; impact printer
                 actuator; impact printing; lumped-parameter
                 description; mathematical models; Poincare plots;
                 Poincar{\'e} plots; print-force; printers;
                 stored-energy actuator; variations",
  treatment =    "P Practical",
}

@Article{Langlois:1983:DSM,
  author =       "William E. Langlois and Ki-Jun Lee",
  title =        "Digital Simulation of Magnetic {Czochralski} Flow
                 Under Various Laboratory Conditions for Silicon
                 Growth",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "281--284",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Previous digital simulations have suggested that an
                 axial magnetic field in the 0.1-T (1000-Gs) range can
                 effectively suppress convection in the Czochralski
                 growth of silicon. The present paper treats the matter
                 more quantitatively by investigating the convection in
                 a variety of flow conditions corresponding to typical
                 Czochralski growth of silicon on a laboratory scale.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7280C (Conductivity of elemental semiconductors);
                 A8110F (Crystal growth from melt); B0510 (Crystal
                 growth); B2520C (Elemental semiconductors); C7410D
                 (Electronic engineering computing)",
  classification = "549; 701; 801; 802; 942",
  corpsource =   "Res. Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "axial magnetic field; convection; crystal growth from
                 melt; crystals --- Growing; Czochralski flow; digital
                 simulation; digital simulations; elemental; elemental
                 semiconductor; flow; magnetic Czochralski; magnetic
                 field effects; magnetic fields; semiconductors; Si
                 growth; silicon; silicon and alloys",
  treatment =    "P Practical",
}

@Article{Wrenner:1983:LMP,
  author =       "Warren R. Wrenner",
  title =        "Large Multi-Layer Panel-Drilling System",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "3",
  pages =        "285--291",
  month =        may,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A description is given of the mechanical, electrical,
                 and control features of an advanced, four-station,
                 twelve-spindle, large-printed-circuit panel-drilling
                 system. The system was designed as a production tool to
                 produce over 35,000 0.4-mm-diameter holes in a panel
                 containing twenty layers of copper and nineteen layers
                 of epoxy glass. Built around a precision, four-station,
                 x-y positioning system with three motor-driven spindles
                 over each work station, the system includes a
                 minicomputer, a printer, a display station, and a
                 controller\slash interface station. Drilling
                 parameters, such as infeed, outfeed, top of stroke,
                 bottom of stroke, and spindle revolution rates, are all
                 computer-controlled.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2210D (Printed circuit manufacture); C3355C (Control
                 applications in machining processes and machine tools);
                 C7420 (Control engineering computing)",
  classification = "544; 603; 713; 723; 817",
  corpsource =   "General Technol. Div., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided manufacturing; computerised control;
                 control features; controller/interface; copper and
                 alloys; display station; drills; electrical features;
                 epoxy glass; epoxy resins; four-station x-y positioning
                 system; integrated circuit manufacture; large
                 multilayer panel-drilling system; machine tools;
                 mechanical features; minicomputer; printed circuits;
                 printer; production tool; spindle revolution rates;
                 station",
  treatment =    "A Application; P Practical",
}

@Article{Lyerla:1983:HCN,
  author =       "J. R. Lyerla and C. S. Yannoni",
  title =        "High-Resolution Carbon-13 {NMR} of Polymers in the
                 Solid State",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "302--312",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A review is presented of the salient features of the
                 methods used for resolution and sensitivity enhancement
                 in **1**3C NMR spectra of solids. Performance
                 characteristics of the unique variable-temperature
                 cross-polarization magic angle spinning (VT-CPMAS)
                 apparatus developed in the laboratory are given. The
                 authors present results of structural studies on
                 fluoropolymers using this technique, and discuss the
                 issue of intensities in cross-polarized spectra. In
                 addition, results of an ongoing VT-CPMAS study of
                 polypropylene dynamics are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7660 (Nuclear magnetic resonance and relaxation);
                 A8280D (Electromagnetic radiation spectrometry
                 (chemical analysis))",
  classification = "801; 815",
  corpsource =   "Dept. of Polymer Sci. and Technol., IBM Res. Div., San
                 Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "/sup; 13/C NMR spectra; cross-polarized spectra;
                 fluoropolymers; magic angle spinning; methods; NMR
                 spectroscopy; nuclear magnetic resonance; performance;
                 polymers; polypropylene dynamics; resolution
                 enhancement; reviews; salient features; sensitivity
                 enhancement; spectrochemical analysis; structural
                 studies; variable-temperature cross-polarization;
                 VT-CPMAS",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Clarke:1983:MAS,
  author =       "T. C. Clarke and J. C. Scott and G. B. Street",
  title =        "Magic Angle Spinning {NMR} of Conducting Polymers",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "313--320",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Because of their typically intractable nature,
                 conducting polymers as a class of materials have proved
                 particularly difficult to characterize by the
                 conventional techniques of polymer analysis. Examples
                 are presented of the application of a powerful new
                 tool, cross-polarization magic angle spinning (CMPAS)
                 **1**3C NMR spectroscopy, to the investigation of the
                 structure and reactions of the conducting polymers
                 polyacetylene and polypyrrole.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7660 (Nuclear magnetic resonance and relaxation)",
  classification = "801; 815",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "/sup 13/C; analysis; conducting polymers; magic angle
                 spinning NMR; NMR spectroscopy; nuclear magnetic
                 resonance; polyacetylene; polymer; polymers;
                 polypyrrole; spectrochemical",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Geiss:1983:PSD,
  author =       "R. H. Geiss and G. B. Street and W. Volksen and J.
                 Economy",
  title =        "Polymer Structure Determination Using Electron
                 Diffraction Techniques",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "321--329",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The crystallographic structure of organic crystals is
                 most commonly studied using x-ray diffraction (XRD)
                 techniques. Unfortunately, rather large crystals, at
                 least 10**6 $\mu$ m**3, are required for XRD analysis,
                 and it often quite difficult and sometimes impossible
                 to prepare such large crystals. On the other hand,
                 electron diffraction techniques, although not nearly as
                 precise as XRD, do afford the capability of studying
                 much smaller crystals. The minimum size for electron
                 diffraction is on the order of 10** minus **3 $\mu$
                 m**3 (0.1 $\mu$ m**2 area by 0.01 $\mu$ m thick). Since
                 most polymer crystals are very sensitive to radiation
                 damage caused by the beam in the electron microscope,
                 special precautions must be taken to minimize beam
                 damage to the specimen. Our approach to minimizing
                 radiation damage, while still obtaining usable
                 diffraction data, is described in terms of using the
                 condenser-objective lens optics of the Philips 301
                 S(TEM) electron microscope. Three examples of the
                 application of electron diffraction structure analysis
                 are given. These include the structures of halogenated
                 polysulfur nitride (SN)$_x$, neutral alpha, alpha prime
                 -polypyrrole, and poly(p-hydroxybenzoic acid) (PHBA).",
  acknowledgement = ack-nhfb,
  classcodes =   "A6114F (Experimental electron diffraction and
                 scattering); A6116D (Electron microscopy determinations
                 of structures); A6140K (Structure of polymers,
                 elastomers, and plastics)",
  classification = "815; 933",
  corpsource =   "Dept. of Phys. Sci., IBM Res. Div., San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(Sn)$_x$; condenser-; crystal structure;
                 crystallographic structure; crystallography; crystals
                 --- Structure; determination; diffraction; electron
                 diffraction crystallography; electron diffraction
                 techniques; electron microscope examination of
                 materials; halogenated; minimizing radiation damage;
                 minimum crystal size; neutral alpha, alpha'-; objective
                 lens optics; organic crystals; PHBA;
                 poly(p-hydroxybenzoic acid); polymer crystals;
                 polymers; polypyrrole; polysulfur nitride; radiation
                 damage; structure; structure analysis; TEM;
                 transmission electron microscopy; X-ray; XRD",
  treatment =    "A Application; X Experimental",
}

@Article{Bargon:1983:ESE,
  author =       "Joachim Bargon and Shamsher Mohmand and Robert J.
                 Waltman",
  title =        "Electrochemical Synthesis of Electrically Conducting
                 Polymers from Aromatic Compounds",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "330--341",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Amorphous, electrically conducting polymeric films can
                 be deposited from acetonitrile solutions of specific
                 aromatic compounds containing an appropriate
                 electrolyte. Free-standing films peeled off a platinum
                 electrode have electrical conductivities sigma between
                 10** minus **3 and 1 OMEGA ** minus **1-cm** minus **1.
                 Polymers resembling the better-known polypyrrole have
                 been obtained from benzenoid, nonbenzenoid, and
                 heterocyclic monomers. A few characteristic examples
                 are discussed to highlight the characterization
                 efforts. Also discussed are the chemical investigations
                 which have provided some insight into the mechanism of
                 formation and the structure of these conducting
                 polymers.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A6855 (Thin film growth, structure, and
                 epitaxy); A8115L (Deposition from liquid phases (melts
                 and solutions)); A8160J (Surface treatment and
                 degradation of polymers and plastics); A8235 (Polymer
                 reactions and polymerization); A8245 (Electrochemistry
                 and electrophoresis); B0520 (Thin film growth); B0560
                 (Polymers and plastics (engineering materials
                 science))",
  classification = "801; 802; 815",
  corpsource =   "Dept. of Chem. Dynamics, IBM Res. Div., San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acetonitrile solutions; amorphous films; aromatic
                 compounds; benzenoid; characterization; chemical
                 reactions --- Oxidation; conducting polymers;
                 conductivities; electrical; electrically;
                 electrochemical synthesis; electrochemistry;
                 electrodeposition; electrolyte; electropolymerisation;
                 examples; free standing films; heterocyclic monomers;
                 nonbenzenoid; organic compounds; polymer films; polymer
                 synthesis; polymeric films; polymerisation; polymers;
                 polypyrrole; Pt electrode",
  treatment =    "P Practical; X Experimental",
}

@Article{Diaz:1983:MPE,
  author =       "A. F. Diaz and B. Hall",
  title =        "Mechanical Properties of Electrochemically Prepared
                 Polypyrrole Films",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "342--347",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The mechanical and conducting properties of
                 free-standing films of polypyrrole toluenesulfonate
                 depend on the preparation conditions. Films prepared in
                 aqueous ethylene glycol solvent mixtures show a
                 variation of two orders of magnitude in the
                 conductivity and of a factor of three in the tensile
                 strength.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A6220 (Mechanical properties of solids
                 (related to microscopic structure)); A7220 (Electrical
                 conductivity phenomena in semiconductors and
                 insulators); A8115L (Deposition from liquid phases
                 (melts and solutions)); A8160C (Surface treatment and
                 degradation of semiconductors); A8160J (Surface
                 treatment and degradation of polymers and plastics);
                 A8235 (Polymer reactions and polymerization); A8245
                 (Electrochemistry and electrophoresis)B0520 (Thin film
                 growth); B0560 (Polymers and plastics (engineering
                 materials science))",
  classification = "801; 817",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aqueous ethylene; conducting; conductivity; electrical
                 conductivity of amorphous semiconductors and;
                 electrochemically prepared polypyrrole films;
                 electrochemistry; electrodeposition;
                 electropolymerisation; free-standing films; glycol
                 solvent mixtures; insulators; mechanical properties;
                 plastics films; polymer films; polymerisation;
                 polypyrrole; preparation conditions; properties;
                 tensile strength; toluenesulfonate",
  treatment =    "P Practical; X Experimental",
}

@Article{Hanchett:1983:EMC,
  author =       "V. E. Hanchett and R. H. Geiss",
  title =        "Electron Microscopy of Carbon-Loaded Polymers",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "348--355",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is very difficult to fully characterize the spatial
                 distribution of particles in carbon-loaded polymers
                 using traditional methods. One approach has been to
                 cross-section the polymers, using ultramicrotomy
                 techniques, to a thickness of 80-100 nm. These sections
                 are then examined in a transmission electron microscope
                 (TEM). Unfortunately, the information on particle
                 dispersion obtained from such images is essentially
                 two-dimensional in nature, and therefore does not lend
                 itself easily to a three-dimensional interpretation. By
                 increasing the thickness of the cross sections to 0.5
                 $\mu$ m or more, one is able to utilize stereoscopic
                 imaging techniques and obtain a three-dimensional image
                 of the carbon particle dispersion. In this way, the
                 characteristic dispersion of the carbon particles may
                 be fully evaluated along a particular direction in the
                 polymer film. Examples are given of the
                 three-dimensional analyses of polymer films containing
                 different carbon-particle loadings.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6116D (Electron microscopy determinations of
                 structures); B0560 (Polymers and plastics (engineering
                 materials science))",
  classification = "741; 815",
  corpsource =   "Dept. of Phys. Sci., IBM Res. Div., San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "C particle dispersion; C-loaded polymers;
                 characteristic; dispersion; examination of materials;
                 filled polymers; morphology; polymers; stereoscopic
                 imaging; techniques; three-dimensional image;
                 transmission electron microscope",
  treatment =    "P Practical; X Experimental",
}

@Article{Farrell:1983:CDI,
  author =       "Edward J. Farrell",
  title =        "Color Display and Interactive Interpretation of
                 Three-Dimensional Data",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "356--366",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Three-dimensional results from engineering and
                 scientific computations often involve the display and
                 interpretation of a large volume of complex data. A
                 method is developed for color display of 3D data with
                 several interactive options to facilitate
                 interpretation. The method is based on representing
                 points whose values fall within a specified range as a
                 single hue. An image is formed by overlaying successive
                 2D frames with increasing hue lightness towards the
                 front. Interactive options to aid interpretations are
                 viewpoint, contour lines, multiple range display,
                 slicing, veiled surfaces, and stereo image pairs. The
                 display method is successfully applied to several types
                 of data. The overall structure and variations of the 3D
                 data are observable, as well as transients which may be
                 overlooked in a large input data set.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C5540 (Terminals and graphic displays);
                 C6130B (Graphics techniques); C7330 (Biology and
                 medical computing)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3D data; cathode-ray tube displays; color; computer
                 graphics; computerised; computerised tomography;
                 contour lines; display; frames; interactive
                 interpretation; interactive options; large input data
                 set; method; multiple range display; overlaying
                 successive 2D; picture processing; slicing; stereo
                 image pairs; three-dimensional data; transients; veiled
                 surfaces; viewpoint",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{McAuley:1983:RDI,
  author =       "David McAuley",
  title =        "Row-By-Row Dynamic Image Analysis of a Matrix of
                 Scanned Points",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "367--375",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A practical image analysis algorithm is described that
                 incorporates features to permit it to carry out its
                 analysis on a row-by-row basis, in contrast to a full
                 image matrix basis. A significant storage saving is
                 realized, since the total image to be scanned is
                 substantially larger than that used by this method. The
                 dynamic build-up of the image on a scan-by-scan or
                 row-by-row basis is carried out by a series of
                 connectivity, pivot, chain set-up, and chaining
                 algorithms used in conjunction with a dynamic memory
                 allocation strategy.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723",
  corpsource =   "IBM UK, Greenock, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chain set-up; chaining algorithms; computerised
                 pattern recognition; computerised picture processing;
                 connectivity; dynamic image analysis; dynamic memory
                 allocation strategy; image analysis algorithm; image
                 processing; image recognition; matrix of scanned
                 points; pivot algorithms; row by row analysis; saving;
                 storage",
  treatment =    "P Practical; X Experimental",
}

@Article{Wahl:1983:HOI,
  author =       "Friedrich Wahl and Samuel So and Kwan Wong",
  title =        "Hybrid Optical-Digital Image Processing Method for
                 Surface Inspection",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "376--385",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A hybrid measurement technique is proposed for
                 high-precision surface inspection. The technique uses
                 an interferometer to image microscopic surface defects.
                 In order to quantify the degree of various surface
                 defects, the interferograms are scanned, digitized, and
                 subsequently converted to a binary image by using an
                 adaptive thresholding technique which takes into
                 account the inhomogeneity of the imaging system. A new
                 misalignment measure for binary patterns identifies the
                 `straightness' of the fringe lines. It is shown that
                 the resulting percentages of misaligned picture
                 elements conform fairly well with the degree of various
                 surface defects.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A0760L
                 (Optical interferometry); B0170L (Inspection and
                 quality control); B6140C (Optical information, image
                 and video signal processing); B7320Z (Other nonelectric
                 variables measurement)C1260 (Information theory); C5260
                 (Digital signal processing); C7410F (Communications
                 computing)",
  classification = "723; 931",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adaptive thresholding; binary image; computerised
                 picture processing; digitized interferograms; fringe
                 lines; high-; hybrid measurement technique; hybrid
                 optical-digital image; image; image processing;
                 inspection; interferograms; interferometer;
                 interferometry; light; microscopic surface defects;
                 misalignment measure; of misaligned picture elements;
                 percentages; precision surface inspection; processing
                 method; surface defects; surface topography
                 measurement; surfaces --- Inspection; technique",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Casey:1983:POS,
  author =       "R. G. Casey and C. R. Jih",
  title =        "A processor-based {OCR} system",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "386--399",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A low-cost optical character recognition (OCR) system
                 can be realized by means of a document scanner
                 connected to a CPU through an interface. The interface
                 performs elementary image processing functions, such as
                 noise filtering and thresholding of the video image
                 from the scanner. The processor receives a binary image
                 of the document, formats the image into individual
                 character patterns, and classifies the patterns
                 one-by-one. A CPU implementation is highly flexible and
                 avoids much of the development and manufacturing costs
                 for special-purpose, parallel circuitry typically used
                 in commercial OCR. A processor-based recognition system
                 has been investigated for reading documents printed in
                 fixed-pitch conventional type fonts, such as occur in
                 routine office typing. Novel, efficient methods for
                 tracking a print line, resolving it into individual
                 character patterns, detecting underscores, and
                 eliminating noise have been devised. A previously
                 developed classification technique, based on decision
                 trees, has been extended in order to improve reading
                 accuracy in an environment of considerable character
                 variation, including the possibility that documents in
                 the same font style may be produced using quite
                 different print technologies.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250B (Character recognition); C7410F
                 (Communications computing)",
  classification = "723; 741",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binary image; character; character recognition;
                 character recognition, optical; classification
                 technique; computerised OCR; computerised pattern
                 recognition; CPU implementation; decision trees;
                 detecting underscores; development cost reduction;
                 document reader; document scanner; elementary image
                 processing functions; eliminating; fixed-pitch
                 conventional type fonts; low-cost; manufacturing costs;
                 noise; noise filtering; OCR system; office automation;
                 optical; optical character recognition; parallel
                 circuitry; print line; processor-based; recognition
                 system; routine office typing; thresholding; tracking;
                 variation; video image",
  treatment =    "A Application; X Experimental",
}

@Article{White:1983:ITO,
  author =       "J. M. White and G. D. Rohrer",
  title =        "Image Thresholding for Optical Character Recognition
                 and Other Applications Requiring Character Image
                 Extraction",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "400--411",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Two new, cost-effective thresholding algorithms for
                 use in extracting binary images of characters from
                 machine-or hand-printed documents are described. The
                 creation of a binary representation from an analog
                 image requires such algorithms to determine whether a
                 point is converted into a binary one because it falls
                 within a character stroke of a binary zero because it
                 does not. This thresholding is a critical step in
                 Optical Character Recognition (OCR). It is also
                 essential for other Character Image Extraction (CIE)
                 applications, such as the processing of machine-printed
                 or handwritten characters from carbon copy forms or
                 bank checks, where smudges and scenic backgrounds, for
                 example, may have to be suppressed. The first
                 algorithm, a nonlinear, adaptive procedure, is
                 implemented with a minimum of hardware and is intended
                 for many CIE applications. The second is a more
                 aggressive approach directed toward specialized,
                 high-volume applications which justify extra
                 complexity.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250B (Character recognition); C7410F
                 (Communications computing)",
  classification = "723; 741",
  corpsource =   "Dept. of Advanced Technol., IBM Information Products
                 Div., Charlotte, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "applications; background suppression; bank checks;
                 bank cheques; carbon copy forms; character image
                 extraction; character recognition, optical; characters;
                 CIE; computerised pattern recognition; computerised
                 picture; extracting binary images; hand-; hardware;
                 high-volume applications; image thresholding; machine
                 printed; nonlinear adaptive procedure; OCR; optical
                 character; optical character recognition; printed
                 documents; processing; recognition; scenic backgrounds;
                 smudges; thresholding algorithms",
  treatment =    "A Application; X Experimental",
}

@Article{Fleisher:1983:ERB,
  author =       "Harold Fleisher and Morton Tavel and John Yeager",
  title =        "{Exclusive-OR} representations of {Boolean}
                 functions",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "4",
  pages =        "412--416",
  month =        jul,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "With the goal of making exclusive-OR formulations of
                 switching functions more readily available to designers
                 for implementation in LSI and VLSI technologies, the
                 authors introduce the concept of an exclusive-OR space
                 in which an exclusive-OR normal form is defined to
                 correspond to the conventional disjunctive normal form.
                 A geometrical representation of exclusive-OR space is
                 described, and its various bases are listed and
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); C4230 (Switching theory)",
  classification = "722; 723",
  corpsource =   "IBM Data Systems Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Boolean functions; computer systems, digital;
                 conventional disjunctive normal form; EX-OR;
                 exclusive-OR representations; exclusive-OR space;
                 geometrical; logic design; representation; SLI;
                 switching functions; VLSI; XOR",
  treatment =    "N New Development; T Theoretical or Mathematical",
}

@Article{Milewski:1983:PSO,
  author =       "A. Milewski",
  title =        "Periodic Sequences with Optimal Properties for Channel
                 Estimation and Fast Start-Up Equalization",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "426--431",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problems of fast channel estimation and fast
                 start-up equalization in synchronous digital
                 communication systems are considered from the viewpoint
                 of the optimization of the training sequence to be
                 transmitted. Various types of periodic sequences having
                 uniform discrete power spectra are studied. Some of
                 them are new and may be generated with data sets
                 commonly used in phase modulation systems. As a
                 consequence of their power spectra being flat, these
                 sequences ensure maximum protection against noise when
                 initial equalizer settings are computed via channel
                 estimates and noniterative techniques.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6110 (Information theory); B6140 (Signal processing
                 and detection); B6210Z (Other data transmission); C5600
                 (Data communication equipment and techniques)",
  classification = "718",
  corpsource =   "IBM France, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binary sequences; digital communication systems;
                 equalisers; fast channel estimation; fast start-up
                 equalization; noniterative techniques; optimisation;
                 periodic sequences; protection against noise; signal
                 processing; synchronous digital communication; systems;
                 training sequences optimisation; uniform discrete power
                 spectra",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Park:1983:ATC,
  author =       "D. I.-H. Park and R. D. Love",
  title =        "Analysis of the Tolerance to Crosstalk Noise of a
                 Pulse Width Modulation System",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "432--439",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reports the results of an investigation to
                 determine the drive degradation caused by random noise
                 in a pulse width modulation (PWM) system originally
                 designed for communicating on coaxial cable but using
                 instead twisted-pair cables. Presented are the analysis
                 of the driver\slash receiver circuit, the theoretical
                 modeling of the transmitted waveforms over the
                 twisted-pair medium using ASTAP, and a methodology for
                 trading off rms noise for transmission capability. The
                 analysis of the effect of noise on drive distance as a
                 function of allowable error rate is derived, and an
                 example is provided. Finally, a simplified analysis
                 technique is proposed to allow rapid calculation of
                 approximate (yet conservative) results.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120 (Modulation methods); B6210Z (Other data
                 transmission)",
  classification = "716",
  corpsource =   "IBM Communications Products Div., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "allowable error; analysis technique; ASTAP; circuit;
                 coaxial cable; crosstalk; digital simulation; drive
                 degradation; drive distance; driver/receiver; pulse;
                 pulse width modulation; PWM; random noise; rate;
                 theoretical modeling; tolerance to crosstalk noise;
                 transmission capability; transmitted waveforms;
                 twisted-pair cables; width modulation system",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Widmer:1983:DPT,
  author =       "A. X. Widmer and P. A. Franaszek",
  title =        "A {DC-Balanced}, Partitioned-Block, {8B\slash 10B}
                 Transmission Code",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "440--451",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a byte-oriented binary
                 transmission code and its implementation. This code is
                 particularly well suited for high-speed local area
                 networks and similar data links, where the information
                 format consists of packets, variable in length, from
                 about a dozen up to several hundred 8-bit bytes. The
                 proposed transmission code translates each source byte
                 into a constrained 10-bit binary sequence which has
                 excellent performance parameters near the theoretical
                 limits for 8B\slash 10B codes. The maximum run length
                 is 5 and the maximum digital sum variation is 6. A
                 single error in the encoded bits can, at most, generate
                 an error burst of length 5 in the decoded domain. A
                 very simple implementation of the code has been
                 accomplished by partitioning the coder into 5B\slash 6B
                 and 3B\slash 4B subordinate coders.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C5600 (Data communication equipment
                 and techniques); B6210Z (Other data transmission)",
  classification = "723",
  corpsource =   "IBM Communication Product Div., Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "8B/10B codes; binary codes; binary sequences;
                 byte-oriented binary; codes; computer networks;
                 constrained 10-bit binary sequence; data links; DC
                 balanced code; encoding; errors; high-speed local area;
                 implementation; length; maximum digital sum variation;
                 maximum run; networks; packet switching;
                 partitioned-block code; performance; subordinate
                 coders; theoretical limits; transmission code",
  treatment =    "A Application; P Practical",
}

@Article{Francois:1983:SMP,
  author =       "P. Fran{\c{c}}ois and A. Potocki",
  title =        "Some Methods for Providing {OSI} Transport in {SNA}",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "452--463",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is made up of three parts: first, a review
                 of open systems interconnection (OSI) objectives,
                 followed by a comparison\slash contrasting of OSI and
                 systems network architecture (SNA) objectives; second,
                 a description of techniques for providing communication
                 between programs residing in systems based on different
                 architectures; and third, the possible application of
                 these techniques to the four lower OSI layers,
                 demonstrating some ways which could be used to provide
                 connectivity between SNA end users and other
                 heterogeneous system end users through OSI protocols.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques)",
  classification = "723",
  corpsource =   "IBM France, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "between programs residing in systems; communication;
                 computer architecture; computer networks; computer
                 networks --- Protocols; objectives; OSI; SNA; systems
                 interconnection; systems network architecture",
  treatment =    "P Practical",
}

@Article{Franaszek:1983:ARL,
  author =       "P. A. Franaszek",
  title =        "Address-Independent Routing for Local Networks",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "464--471",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A routing methodology is introduced which permits
                 messages to be propagated throughout a network without
                 recourse to destination or origin addresses. Two
                 classes of networks, bidirectional trees and augmented
                 rings, are analyzed from this point of view. An
                 optimality property is proved for the bidirectional
                 tree, and three types of address-independent routing
                 strategies are derived. It is shown that augmented
                 loops, a class of structures incorporating redundant
                 links, may be rerouted to compensate for the failure of
                 any single node or link.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6150 (Communication system theory); B6210L (Computer
                 communications); C5620 (Computer networks and
                 techniques)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "address-independent routing strategies; augmented
                 loops; augmented rings; bidirectional trees; classes of
                 networks; computer networks; local networks; optimality
                 property; redundant links; routing methodology;
                 switching theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Iglehart:1983:SNM,
  author =       "Donald L. Iglehart and Gerald S. Shedler",
  title =        "Simulation of non-{Markovian} systems",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "??",
  pages =        "472--480",
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "521.60092",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Iglehart:1983:SNS,
  author =       "Donald L. Iglehart and Gerald S. Shedler",
  title =        "Simulation of Non-{Markovian} Systems",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "472--480",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "60K15 (68C15 68J05)",
  MRnumber =     "84k:60115",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A generalized semi-Markov process provides a
                 stochastic process model for a discrete-event
                 simulation. This representation is particularly useful
                 for non-Markovian systems where it is nontrivial to
                 obtain recurrence properties of the underlying
                 stochastic processes. `Geometric trials' arguments can
                 be used to obtain results on recurrence and
                 regeneration in this setting. Such properties are
                 needed to establish estimation procedures based on
                 regenerative processes. Applications to modeling and
                 simulation of ring and bus networks are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240Z (Other topics in statistics); B6210L (Computer
                 communications); C1140Z (Other topics in statistics);
                 C5620 (Computer networks and techniques); C7410F
                 (Communications computing)",
  classification = "723; 731",
  corpsource =   "Stanford Univ., Stanford, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bus networks; computer networks; control systems,
                 stochastic; digital simulation; discrete-event
                 simulation; estimation; generalised semiMarkov process;
                 geometric trials; modeling; nonMarkovian systems;
                 procedures; recurrence; regeneration; regenerative
                 processes; ring networks; stochastic process model;
                 stochastic processes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Strole:1983:LCN,
  author =       "Norman C. Strole",
  title =        "Local Communications Network Based on Interconnected
                 Token-Access Rings: a Tutorial",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "481--496",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is a tutorial of the fundamental aspects of
                 the architecture, physical components, and operation of
                 a token-ring LAN. Particular emphasis is placed on the
                 fault detection and isolation capabilities that are
                 possible, as well as the aspects that allow for network
                 expansion and growth. The role of the LAN relative to
                 IBM's Systems Network Architecture (SNA) is also
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620 (Computer
                 networks and techniques)",
  classification = "723",
  corpsource =   "IBM Communication Products Div., Research Triangle
                 Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "area network; components; computer networks;
                 extendible; fault detection; fault isolation; fault
                 location; group of nodes; high-speed data transfer;
                 IBM's systems network architecture; interconnected
                 token-access rings; LAN; large networks; local; local
                 communications; network; network architecture; network
                 expansion; operation; physical; requirements; small
                 networks; SNA; star/ring wiring topology; token-access
                 control; tutorial",
}

@Article{Blaauw:1983:ORE,
  author =       "G. A. Blaauw and A. J. W. Duijvestijn and R. A. M.
                 Hartmann",
  title =        "Optimization of Relational Expressions Using a Logical
                 Analogon",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "5",
  pages =        "497--519",
  month =        sep,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 ftp://ftp.ira.uka.de/pub/bibliography/Database/Wiederhold.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An expression applying to a relational database is
                 optimized by mapping the expression upon set
                 expressions which, in turn, are transformed into
                 logical expressions. These logical expressions then are
                 optimized, taking into account the constraints that are
                 inherent in relational expressions and the costs of
                 those expressions. Subsequently a reverse
                 transformation to relational expressions is applied.
                 The method is developed for the traditional relational
                 operators and is applicable to a variety of cost
                 criteria. Common subexpressions as well as redundant
                 expressions are optimized. A new relational operation
                 `split' is proposed that may be used effectively in an
                 optimized expression. Results obtained with a model for
                 the optimization method are presented.",
  acknowledgement = ack-nhfb,
  annote =       "relational expressions (including `exclusion') become
                 set expressions (using the Universal relation concept)
                 with only INTERSECT, UNION, and DIF., and then logical
                 expressions with AND, OR, and NOT. To facilitate
                 removal of common subexpressions a SPLIT operation is
                 introduced.",
  classcodes =   "C6160D (Relational databases)",
  classification = "723; 922",
  corpsource =   "Dept. of Computer Sci., Twente Univ. of Technol.,
                 Enschede, Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "costs; database; database management systems; database
                 systems; logical analogon; logical expressions;
                 operators; optimisation; optimization; redundant
                 expressions; relational; relational expressions;
                 relational operation split; reverse transformation;
                 subexpressions; traditional relational",
  review =       "ACM CR 8404-297",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Gum:1983:SEA,
  author =       "P. H. Gum",
  title =        "{System\slash 370} Extended Architecture: Facilities
                 for Virtual Machines",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "530--544",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the evolution of facilities for
                 virtual machines on IBM System\slash 370 computers, and
                 presents the elements of a new architectural facility
                 designed for the virtual-machine environment. Assists
                 that have been added to various System\slash 370 models
                 to support the use of virtual machines are summarized,
                 and a general facility for this purpose which was
                 introduced with the System\slash 370 Extended
                 Architecture (370-XA) is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C7430 (Computer
                 engineering)",
  classification = "723",
  corpsource =   "IBM Information Systems and Technol. Group,
                 Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "370-XA architecture; computer architecture; computers;
                 data storage, digital; dynamic address translation;
                 Extended Architecture; IBM System/370; privileged
                 instructions; virtual machines",
  treatment =    "P Practical",
}

@Article{Meister:1983:MYF,
  author =       "Bernd Meister",
  title =        "On {Murphy}'s Yield Formula",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "545--548",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Some properties of yield are presented, and one lower
                 and three upper bounds for yield are derived. Some of
                 these bounds represent yield formulas already known as
                 useful approximations. Pure Poisson statistics for
                 defect density provides the lower bound. The upper
                 bounds are obtained with mixtures of Poisson
                 distributions and a formula of Price and Stapper.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2570
                 (Semiconductor integrated circuits)",
  classification = "921; 922",
  corpsource =   "IBM Res. Div., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuits; defect density; formula; integrated circuit
                 technology; lower bounds; mathematical techniques;
                 monolithic integrated; Murphy's yield; Poisson
                 statistics; Price and Stapper formula; probability;
                 statistical analysis; upper bounds",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Stapper:1983:MIC,
  author =       "C. H. Stapper",
  title =        "Modeling of Integrated Circuit Defect Sensitivities",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "549--557",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper treats the fundamentals of the defect
                 models that have been used successfully at IBM for a
                 period of more than fifteen years. The effects of very
                 small defects are discussed first. The case of
                 photolithographic defects, which are of the same
                 dimensions as the integrated circuit device and
                 interconnection patterns, is dealt with in the
                 remainder of the paper. The relationships between these
                 models and tests sites are described. Data from
                 measurements of defect sizes are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)B2560B (Semiconductor device modelling and
                 equivalent circuits); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 921; 922",
  corpsource =   "IBM General Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "defect sizes; IBM; integrated circuit defect
                 sensitivities; integrated circuit manufacture; large
                 scale integration; mathematical models; monolithic ICs;
                 monolithic integrated circuits; photolithographic
                 defects; photolithography; semiconductor device models;
                 sites; test",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Beichter:1983:SLS,
  author =       "F. Beichter and O. Herzog and H. Petzsch",
  title =        "{SLAN-4}: a Language for the Specification and Design
                 of Large Software Systems",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "558--576",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The language SLAN-4 has been defined in view of the
                 need for formal tools supporting the specification and
                 design of large software systems. It offers its users
                 language constructs for algebraic and axiomatic
                 specifications as well as for design in pseudocode. One
                 of its major design goals has been to ease subsequent
                 refinements of a (given) specification. The user can
                 start his development with an informal high-level
                 specification which can be formalized and implemented
                 at a later date by using lower-level concepts. This
                 paper provides the formal definitions of the SLAN-4
                 language, discusses the design decisions, and presents
                 examples for the use of the syntactic constructs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  classification = "723",
  corpsource =   "IBM System Products Div., Boeblingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algebraic specifications; axiomatic specifications;
                 computer programming languages; computer software; high
                 level languages; high-level specification; language
                 constructs; large software systems; pseudocode; SLAN-4;
                 syntactic constructs",
  treatment =    "P Practical",
}

@Article{Moler:1983:RSR,
  author =       "Cleve Moler and Donald Morrison",
  title =        "Replacing Square Roots by {Pythagorean} Sums",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "577--581",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.276.0577",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/bibnet/authors/m/moler-cleve-b.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5390405;
                 http://www.research.ibm.com/journal/rd/276/ibmrd2706P.pdf",
  abstract =     "An algorithm is presented for computing a `Pythagorean
                 sum' $ a \osum b = \sqrt {a^2 + b^2} $ directly from
                 $a$ and $b$ without computing their squares or taking a
                 square root. No destructive floating point overflows or
                 underflows are possible. The algorithm can be extended
                 to compute the Euclidean norm of a vector. The
                 resulting subroutine is short, portable, robust, and
                 accurate, but not as efficient as some other
                 possibilities. The algorithm is particularly attractive
                 for computers where space and reliability are more
                 important than speed",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods); C5230 (Digital
                 arithmetic methods)",
  classification = "723",
  corpsource =   "Dept. of Computer Sci., Univ. of New Mexico,
                 Albuquerque, NM, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computer metatheory --- Algorithmic
                 Languages; computer programming; digital arithmetic;
                 Euclidean norm; floating-point arithmetic; iterative
                 methods; performance; Pythagorean sums; subroutine;
                 vector",
  review =       "ACM CR 8406-0463",
  subject =      "G.1 Mathematics of Computing, NUMERICAL ANALYSIS,
                 Roots of Nonlinear Equations \\ F.2.1 Theory of
                 Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
                 COMPLEXITY, Numerical Algorithms and Problems,
                 Computations on polynomials \\ F.2.2 Theory of
                 Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
                 COMPLEXITY, Nonnumerical Algorithms and Problems,
                 Geometrical problems and computations",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dubrulle:1983:CNM,
  author =       "Augustin A. Dubrulle",
  title =        "Class of Numerical Methods for the Computation of
                 {Pythagorean} Sums",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "582--589",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/bibnet/authors/m/moler-cleve-b.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Moler and Morrison have described an iterative
                 algorithm for the computation of the Pythagorean sum
                 (a**2 plus b**2)** one-half of two real numbers a and
                 b. This algorithm is immune to unwarranted
                 floating-point overflows, has a cubic rate of
                 convergence, and is easily transportable. This paper,
                 which shows that the algorithm is essentially Halley's
                 method applied to the computation of square roots,
                 provides a generalization to any order of convergence.
                 Formulas of orders 2 through 9 are illustrated with
                 numerical examples. The generalization keeps the number
                 of floating-point divisions constant and should be
                 particularly useful for computation in high-precision
                 floating-point arithmetic.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods); C5230 (Digital
                 arithmetic methods)",
  classification = "723; 921",
  corpsource =   "IBM Sci. Centre, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; digital arithmetic;
                 floating-point divisions; Halley's method;
                 high-precision floating-point arithmetic; iterative
                 algorithm; iterative methods; mathematical techniques
                 --- Numerical Methods; Pythagorean sums; rate of
                 convergence; square roots",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Lee:1983:BSE,
  author =       "H. C. Lee and H. D. Conway",
  title =        "Bending and stretching an elastic strip around a
                 narrow cylindrical drum",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "590--597",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A4630C (Elasticity); A4630J (Viscoelasticity,
                 plasticity, viscoplasticity, creep, and stress
                 relaxation)",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "anticlastic deformation; bending; deflected forms;
                 elastic deformation; elastic strip; elasticity; narrow
                 cylindrical drum; stretching; strip width; tension",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Houser:1983:ATW,
  author =       "D. E. Houser and K. J. Lubert",
  title =        "Automated Twisted-Pair Wire Bonding",
  journal =      j-IBM-JRD,
  volume =       "27",
  number =       "6",
  pages =        "598--606",
  month =        nov,
  year =         "1983",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A need for highly dense and reworkable external
                 interconnections with controlled characteristic
                 impedance on high-performance printed-circuit boards
                 led to the development of the process and equipment
                 described in this paper. These interconnections are
                 required to implement engineering changes, to install
                 precise circuit delays, to repair printed-circuit
                 defects, and to complete interconnections not possible
                 with printed circuitry alone. As an economical way to
                 meet the characteristic impedance requirement of 80
                 plus or minus 10 OMEGA and the density requirement for
                 terminations on a 2.5-mm `staggered' grid (twice as
                 dense as a 2.5-mm-square grid), 39-gauge twisted-pair
                 wire is used. A solder-reflow process bonds the wires
                 to the printed circuitry and meets the need for
                 reworkability. Computer-controlled equipment, developed
                 to install twisted-pair wires at production rates, is
                 now being used in several IBM plants worldwide.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170E (Production facilities and engineering); B2210D
                 (Printed circuit manufacture); C3350Z (Control
                 applications in other industries); C7410D (Electronic
                 engineering computing); C7420 (Control engineering
                 computing)",
  classification = "704; 714",
  corpsource =   "IBM General Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "39-gauge twisted-pair wire; boards; characteristic
                 impedance; computer controlled equipment; control;
                 controlled; electric connectors; electronic equipment
                 manufacture; high-performance printed-circuit; IBM
                 plants; manufacturing computer; printed circuits;
                 printed-circuit defects; reworkable external
                 interconnections; solder-reflow process; soldering;
                 twisted-pair wire bonding",
  treatment =    "P Practical",
}

@Article{Adams:1984:OPS,
  author =       "Edward N. Adams",
  title =        "Optimizing Preventive Service of Software Products",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "2--14",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is found that most of the benefit to be realized by
                 preventive service comes from removing a relatively
                 small number of high-rate defects that are found early
                 in the service life of the code. For the typical user
                 corrective service would seem preferable to preventive
                 service as a way of dealing with most defects found
                 after code has had some hundreds of months of usage.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6100 (Software techniques and systems)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "additional software; computer software; corrective
                 service; defects; design errors; fixes for defects;
                 hundreds of months of usage; modeling problem
                 occurrence; preventive service optimisation; problems;
                 process in execution time; program debugging; random;
                 small number of high-rate; software developer; software
                 engineering; software errors; software products;
                 software user",
  treatment =    "A Application; P Practical",
}

@Article{Hall:1984:CNC,
  author =       "N. R. Hall and S. Preiser",
  title =        "Combined Network Complexity Measures",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "15--27",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Paper describes techniques to measure the complexity
                 of large (greater than 100,000 source lines of code)
                 systems during the software architecture phase, before
                 major design decisions have been made. Methods
                 developed include (1) an extension of the
                 graph-theoretic measure developed by McCabe to software
                 architecture, as represented by networks of
                 communicating modules, (2) a general technique that
                 allows the complexity associated with allocation of
                 resources (CPU, tape, disk, etc.) to be measured, and
                 (3) a method that combines module complexity and
                 network complexity, so that design trade-offs can be
                 studied to determine whether it is advantageous to have
                 separate modules for service functions, such as
                 mathematical subroutines, data management routines,
                 etc.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C6110
                 (Systems analysis and programming)",
  classification = "723",
  corpsource =   "IBM Federal Systems Div., Bethesda, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "allocation of resources; before major design;
                 complexity measurement; complexity reduction;
                 computational complexity; computer architecture;
                 computer networks; computer software; consistent
                 results; data management routines; decisions; design
                 languages; design trade-offs; engineering;
                 graph-theoretic measure; mathematical; module
                 complexity; network complexity; networks of
                 communicating modules; number of source lines of code
                 >100000; programming theory; separate modules for
                 service functions; software; software architecture
                 phase; software complexity; source code; subroutines;
                 techniques",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Sowa:1984:ILI,
  author =       "John F. Sowa",
  title =        "Interactive Language Implementation System",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "28--39",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Interactive Language Implementation System (ILIS)
                 is a tool for implementing language processors. It is
                 fast enough for conventional compilers and general
                 enough for processing natural languages. ILIS is built
                 around a language for writing grammars. Unlike most
                 compiler-compilers, the language includes a full range
                 of semantic operators that reduce or eliminate the need
                 for invoking other programming languages during a
                 translation. ILIS is also highly interactive: It has
                 facilities for tracing a parse and for adding or
                 deleting grammar rules dynamically. This paper
                 describes the features of ILIS and its use in several
                 different projects.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C4240 (Programming and algorithm
                 theory); C6150C (Compilers, interpreters and other
                 processors)",
  classification = "723",
  corpsource =   "IBM Systems Res. Inst., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compiler-compilers; compilers; computer programming
                 languages; deleting grammar rules dynamically;
                 engineering; features; full range of semantic
                 operators; grammars; highly; ILIS; interactive;
                 Interactive Language Implementation System; language
                 for writing grammars; parsers; processing natural
                 languages; program compilers; programming theory;
                 software; tool for implementing language processors",
  treatment =    "P Practical",
}

@Article{Ris:1984:EAF,
  author =       "Frederic N. Ris",
  title =        "Experience with Access Functions in an Experimental
                 Compiler",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "40--51",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an access function subsystem
                 embedded in portions of an experimental microcode
                 compiler which was built and used during 1973-6 using
                 the IBM PL/I optimizing compiler under VM\slash 370 and
                 CMS. The use of the access function subsystem in this
                 context was itself an experiment, performed by a group
                 for all of whom PL/I was a new language and VM\slash
                 370 a new operating system. The implementation of the
                 subsystem was done strictly within the confines of the
                 PI/I language. The basic objectives were ease of use,
                 provision of a focal point for global storage
                 management, extensive run-time validity checking with
                 appropriate diagnostics, and data protection. Beyond
                 satisfying these objectives, the subsystem proved more
                 valuable than anticipated due to positive contributions
                 made to debugging code in the VM\slash 370 interactive
                 development environment.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "722; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access function subsystem; CMS; computer operating
                 systems; data protection; debugging code; diagnostics;
                 ease of; experience; experimental; extensive; focal
                 point for global storage management; IBM PL/I
                 optimizing compiler; implementation; microcode
                 compiler; objectives; operating system; PL/1; program
                 compilers; run-time validity checking; use; VM/370;
                 VM/370 interactive development environment",
  treatment =    "A Application; X Experimental",
}

@Article{Strom:1984:NPM,
  author =       "Robert Strom and Nagui Halim",
  title =        "New Programming Methodology for Long-Lived Software
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "52--59",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new software development methodology based on the
                 language NIL is presented. The methodology emphasizes
                 (1) the separation of program development into
                 functional specification and tuning phases, (2) the use
                 of a fully compilable and executable design, (3) an
                 interface definition and verification mechanism. This
                 approach reduces life-cycle costs and improves software
                 quality because (a) errors are detected earlier, and
                 (b) a single functional design can be re-used to
                 produce many implementations.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6140D (High
                 level languages)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compatible design; computer programming languages;
                 computer software; errors are detected earlier;
                 executable design; functional; functional
                 specification; high level languages; interface
                 definition; language NIL; life-cycle costs; long-lived
                 software systems; phase; programming; single functional
                 design; software development methodology; software
                 engineering; software portability; software quality;
                 specification; tuning phase; verification mechanism",
  treatment =    "N New Development",
}

@Article{Alberga:1984:PDT,
  author =       "C. N. Alberga and A. L. Brown and G. B. {Leeman, Jr.}
                 and M. Mikelsons and M. N. Wegman",
  title =        "A program development tool",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "60--73",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes how authors have combined a
                 number of tools (most of which are tailored to a
                 particular programming language) into a single system
                 to aid in the reading, writing, and running of
                 programs. Discussed is the efficacy and the structure
                 of two such systems, one of which has been used to
                 build several large application programs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; efficacy; large application
                 programs; program development tool; programming;
                 programs; reading programs; running of; software
                 engineering; structured programming; writing programs",
  treatment =    "A Application; P Practical",
}

@Article{Kruskal:1984:MMP,
  author =       "Vincent Kruskal",
  title =        "Managing Multi-Version Programs with an Editor",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "74--81",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "When more than one version of a program must be
                 maintained, generally much of the code is repeated
                 unchanged in many versions. Techniques such as `deltas'
                 and conditional compilation are commonly used to avoid
                 duplicating these common parts. In addition to saving
                 storage, these methods aid the programmer greatly in
                 managing updates to the versions. Unfortunately, these
                 representations of multi-version programs can appear
                 very unlike a program, making them difficult to edit.
                 Described here is a new method of automating much of
                 the bookkeeping involved in dealing with multi-version
                 programs. It entails use of a special editor that
                 enables a multi-version program to be seen and modified
                 in a fashion that is far closer to that normally
                 permitted for a single-version program.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming); C6120 (File
                 organisation); C6150C (Compilers, interpreters and
                 other processors)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bookkeeping; computer programming; conditional
                 compilation; data structures; deltas; editor; managing
                 updates; multi-version; multiversion programs
                 management; program processors; programs; special
                 editor",
  treatment =    "N New Development",
}

@Article{Casanova:1984:MUS,
  author =       "Marco A. Casanova and Jose E. {Amaral de Sa}",
  title =        "Mapping Uninterpreted Schemes into Entity-Relationship
                 Diagrams: Two Applications to Conceptual Schema
                 Design",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "82--94",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method of mapping sets of uninterpreted record or
                 relation schemes into entity-relationship diagrams is
                 described and then applied to two conceptual design
                 problems. First, the method is applied to the design of
                 relational databases. It is shown that the method can
                 be interpreted as a normalization procedure that maps a
                 given relational schema into a new schema that
                 represents an entity-relationship diagram. That is, the
                 original schema has an interpretation in terms of
                 higher-order concepts, which helps in understanding the
                 semantics of the database it describes. The second
                 design problem is related to the conversion of
                 conventional file systems to the database approach.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6160D (Relational databases)",
  classification = "723",
  corpsource =   "IBM Brazil Sci. Center, Brasilia, Brazil",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "conceptual design problems; conceptual schema design;
                 database conceptual schema; database management
                 systems; database semantics; database systems; DBMS;
                 design; entity-relationship diagrams; file to database
                 conversion; higher-; normalization procedure; of
                 relational databases; order concepts; uninterpreted
                 schemes mapping",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Goyal:1984:PAF,
  author =       "A. Goyal and T. Agerwala",
  title =        "Performance Analysis of Future Shared Storage
                 Systems",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "1",
  pages =        "95--108 (or 95--107??)",
  month =        jan,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with the analysis and design of two
                 important classes of computer systems; BIP (Billion
                 Instructions Per Second) systems consisting of a few
                 very high performance processors and KMIP (K Million
                 Instructions Per Second) systems with hundreds of low
                 speed processors. Each system has large, shared
                 semiconductor memories. Simple analytic models are
                 developed for estimating the performance of such
                 systems. The models are validated using simulation.
                 They can be utilized to quickly reduce the design space
                 and study various trade-offs. The models are applied to
                 BIP and KMIP systems and their use is illustrated using
                 examples.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C5320G (Semiconductor
                 storage)C5420 (Mainframes and minicomputers)",
  classification = "714; 721; 722; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytical models; billion instructions per; BIP; BIP
                 systems; classes of computer systems; computer
                 architecture; computer systems, digital; data storage,
                 semiconductor --- Performance; design space; design
                 tradeoffs; distributed processing; few very high
                 performance; hundreds of low speed processors; K
                 million instruction per second systems; KMIP; KMIP
                 systems; parallel; performance analysis; processing;
                 processors; second systems; semiconductor memories;
                 semiconductor storage; shared; shared storage systems;
                 simulation; supercomputers; validated using",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chen:1984:ECS,
  author =       "C. L. Chen and M. Y. Hsiao",
  title =        "Error-Correcting Codes for Semiconductor Memory
                 Applications: a State-Of-The-Art Review",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "124--134",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a state-of-the-art review of
                 error-correcting codes for computer semiconductor
                 memory applications. The construction of four classes
                 of error-correcting codes appropriate for semiconductor
                 memory designs is described, and for each class of
                 codes the number of check bits required for commonly
                 used data lengths is provided. The implementation
                 aspects of error correction and error detection are
                 also discussed, and certain algorithms useful in
                 extending the error-correcting capability for the
                 correction of soft errors such as alpha
                 -particle-induced errors are examined in some detail.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B6120B (Codes); C5320G
                 (Semiconductor storage)",
  classification = "714; 723",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alpha -particle-induced errors; check bits; codes,
                 symbolic; computer; data lengths; data storage,
                 semiconductor; error correction codes; error-correcting
                 codes; reviews; semiconductor memory; semiconductor
                 storage; soft errors; state-of-the-art review",
  treatment =    "A Application; P Practical",
}

@Article{Langdon:1984:IAC,
  author =       "Glen G. {Langdon, Jr.}",
  title =        "An introduction to arithmetic coding",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "135--149",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A29",
  MRnumber =     "85h:94016a",
  bibdate =      "Sat Feb 24 09:36:01 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See comment \cite{Langdon:1984:EIA}.",
  abstract =     "Arithmetic coding is a data compression technique that
                 encodes data (the data string) by creating a code
                 string which represents a fractional value on the
                 number line between 0 and 1. Arithmetic coding differs
                 considerably from the more familiar compression coding
                 techniques, such as prefix (Huffman) codes. This paper
                 presents the key notions of arithmetic compression
                 coding by means of simple examples.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arithmetic coding; code string; codes, symbolic;
                 coding algorithm; data compression; data compression
                 technique; data processing --- Data Compression; data
                 string; encoding; intervals; magnitude comparisons;
                 nested; symbolwise recursive",
  treatment =    "P Practical",
}

@Article{Blahut:1984:URD,
  author =       "Richard E. Blahut",
  title =        "A universal {Reed--Solomon} decoder",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "150--158",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Two architectures for universal Reed--Solomon decoders
                 are given. These decoders, called time-domain decoders,
                 work directly on the raw data word as received without
                 the usual syndrome calculation or power-sum-symmetric
                 functions. Up to the limitations of the working
                 registers, the decoders can decode any Reed--Solomon
                 codeword or BCH codeword in the presence of both errors
                 and erasures. Provision is also made for decoding
                 extended codes and shortened codes.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes)",
  classification = "723",
  corpsource =   "IBM Federal Syst. Div., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "BCH codeword; codes; codes, symbolic; decoding;
                 extended codes; shortened; time-domain decoders;
                 universal Reed--Solomon decoders; working registers",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Blahut:1984:URS,
  author =       "Richard E. Blahut",
  title =        "A universal {Reed--Solomon} decoder",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "??",
  pages =        "150--158",
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  ZMnumber =     "538.94015",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ariat:1984:IEA,
  author =       "J. Ariat and W. C. Carter",
  title =        "Implementation and evaluation of a $(b,k)$-adjacent
                 error-correcting\slash detecting scheme for
                 superconductor systems",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "159--169",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a coding scheme developed for a
                 specific supercomputer architecture and structure. The
                 code considered is a shortened (b,k)-adjacent
                 single-error-correcting double-error
                 probabilistic-detecting code with b equals 5, k equals
                 1, and code group width equals 4. An evaluation of the
                 probabilistic double-error-detection capability of the
                 code was performed for different organizations
                 encompassing the traditional feature of memory data
                 error protection and also providing for the detection
                 of major addressing errors that may result from faults
                 affecting the interconnection network communication
                 modules. The cost of implementation is a limited amount
                 of extra hardware and a negligible degradation in the
                 double-error-detection properties of the code.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C5440 (Multiprocessing
                 systems); C6130 (Data handling techniques)",
  classification = "723",
  corpsource =   "Lab. for Autom. and Syst. Anal., Nat. Center for Sci.
                 Res., Toulouse, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(b,k)-adjacent error-correcting/detecting scheme;
                 addressing errors; code; code group width; codes,
                 symbolic; coding/decoding strategies; communications
                 modules; computer architecture; detection codes;
                 double-error probabilistic-detecting; error; error
                 correction codes; interconnection network;
                 organization; parallel processing; superconductor
                 systems; system",
  treatment =    "P Practical",
  xxauthor =     "J. Arlat and W. C. Carter",
}

@Article{Bossen:1984:FAE,
  author =       "D. C. Bossen and C. L. Chen and M. Y. Hsiao",
  title =        "Fault Alignment Exclusion for Memory Using Address
                 Permutation",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "170--176",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A significant improvement in memory fault tolerance,
                 beyond what is already provided by the use of an
                 appropriate error-correcting code (ECC), can be
                 achieved by electronic chip swapping, without any
                 compromise of data integrity as large numbers of faults
                 are allowed to accumulate. Since most large and
                 medium-sized semiconductor memories are organized so
                 that each bit position of the system word (ECC
                 codeword) is fed from a different chip, and quite often
                 from a different array card, or at least from distinct
                 partitions of an array card, the various bit positions
                 have separate address circuitry on the array cards.
                 This fact is important, and can be exploited to provide
                 effective address permutation capability, which allows
                 the realignment of faults which would otherwise have
                 caused an uncorrectable multiple error in an ECC
                 codeword.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); C5320G (Semiconductor
                 storage); C6120 (File organisation)",
  classification = "714; 723",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "address permutation; capability; chip swapping; codes,
                 symbolic --- Error Correction; computer systems,
                 digital; data storage, semiconductor; electronic; error
                 correction codes; error-correcting code; EX-OR
                 circuitry; fault map; fault tolerant computing; memory
                 fault tolerance; redundancy; semiconductor memories;
                 semiconductor storage; storage latches; storage
                 management",
  treatment =    "P Practical",
}

@Article{Aichelmann:1984:FDT,
  author =       "F. J. {Aichelmann, Jr.}",
  title =        "Fault-Tolerant Design Techniques for Semiconductor
                 Memory Applications",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "177--183",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In this paper, a number of design approaches are
                 presented for minimizing the effects of chip failures
                 through the use of organizational techniques and
                 through enhancements to conventional error checking and
                 correction facilities. The fault-tolerant design
                 techniques described are compatible with most existing
                 memory designs. An evaluative comparison of these
                 techniques is included, and their application and
                 utility are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); C5320G (Semiconductor
                 storage)",
  classification = "714; 721; 723",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "codes, symbolic --- Error Correction; computer
                 systems, digital; correction facilities; data storage,
                 semiconductor; error checking; error correction; error
                 detection; fault tolerant computing; fault-tolerant
                 design; memory; memory chips; multiple-bit-per-chip
                 organization; reliability; semiconductor memory;
                 semiconductor storage; system",
  treatment =    "P Practical",
}

@Article{Chen:1984:FMS,
  author =       "C. L. Chen and R. A. Rutledge",
  title =        "{Fault-tolerant Memory Simulator}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "184--195",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the Fault-Tolerant Memory
                 Simulator (FTMS), an interactive APL program which uses
                 Monte Carlo simulation to evaluate the reliability of
                 fault-tolerant memory systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140G (Monte Carlo methods); C5310 (Storage system
                 design); C7430 (Computer engineering)",
  classification = "714; 721; 723",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL program; computer systems, digital; computing;
                 data storage, semiconductor; digital simulation;
                 digital storage; failure rate; fault tolerance; fault
                 tolerant; Fault-Tolerant Memory Simulator; interactive;
                 memory systems; Monte Carlo methods; Monte Carlo
                 simulation; reliability; system",
  treatment =    "P Practical",
}

@Article{Libson:1984:GMR,
  author =       "M. R. Libson and H. E. Harvey",
  title =        "A general-purpose memory reliability simulator",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "196--205",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a Monte Carlo simulator which can
                 predict uncorrectable error rates and
                 field-replaceable-unit replacement rates for a wide
                 range of memory architectures and under a variety of
                 maintenance strategies. The model provides valuable
                 information for performing sensitivity studies of
                 intrinsic failure rates for memory components, for
                 performing tradeoff studies of alternative storage
                 module and card organizations, for evaluating system
                 functions, and for establishing optimum maintenance
                 strategies.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140G (Monte Carlo methods); C5310 (Storage system
                 design); C7430 (Computer engineering)",
  classification = "714; 721; 723; 922",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer; data storage, semiconductor; digital
                 simulation; digital storage; error correction; failure
                 rates; field service frequency; general-purpose memory
                 reliability simulator; maintenance strategies;
                 mathematical statistics --- Monte Carlo Methods;
                 memory; methods; modules; Monte Carlo; optimal
                 maintenance strategies; simulator; storage management;
                 uncorrectable error",
  treatment =    "P Practical",
}

@Article{Howell:1984:ACE,
  author =       "Thomas D. Howell",
  title =        "Analysis of Correctable Errors in the {IBM 3380} Disk
                 File",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "206--211",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method of analyzing the correctable errors in disk
                 files is presented. It allows one to infer the most
                 probable error in the encoded-data stream given only
                 the unencoded readback and error-correction
                 information. This method is applied to the errors
                 observed in seven months of operation of four IBM 3380
                 head-disk assemblies. It is shown that nearly all the
                 observed errors can be explained as single-bit errors
                 at the input to the channel decoder. About 90 percent
                 of the errors were related to imperfections in the disk
                 surfaces. The remaining 10 percent were mostly due to
                 heads which were unusually susceptible to random
                 noise-induced errors.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media)",
  classification = "723",
  corpsource =   "IBM Res. Div., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "codes, symbolic; correctable errors; disk surfaces;
                 error analysis; errors; IBM 3380 disk file; magnetic
                 disc storage; most probable error; random
                 noise-induced; single-bit errors; storage management",
  treatment =    "P Practical",
}

@Article{Tang:1984:IEP,
  author =       "D. T. Tang and C. L. Chen",
  title =        "Iterative Exhaustive Pattern Generation for Logic
                 Testing",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "2",
  pages =        "212--219",
  month =        mar,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Exhaustive pattern logic testing schemes provide all
                 possible input patterns with respect to an output in
                 the set of test patterns. This paper is concerned with
                 the problem that arises when this is to be done
                 simultaneously with respect to a number of outputs,
                 using a single test set. More specifically, this paper
                 describes an iterative procedure for generating a test
                 set consisting of n-dimensional vectors which
                 exhaustively covers all k-subspaces simultaneously,
                 i.e., the projections of n-dimensional vectors in the
                 test set onto any input subset of a specified size k
                 contain all possible patterns of k-tuples.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265 (Digital electronics); C5210 (Logic design
                 methods)",
  classification = "721",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "exhaustive pattern generation; iterative; iterative
                 methods; k-subspaces; logic circuits; logic testing;
                 n-dimensional vectors; nonbinary cases; procedure; test
                 set; vectors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Myers:1984:ITI,
  author =       "R. A. Myers and J. C. Tamulis",
  title =        "Introduction to Topical Issue on Non-Impact Printing
                 Technologies",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "234--240",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper, presents an overview of the technologies
                 of importance in computer output printing, providing a
                 background for the succeeding papers in this issue. IBM
                 workers have played a key role in the evolution of
                 computer printers from a few marginally reliable
                 complex mechanisms to an industry which today counts
                 annual sales of over ten billion dollars worldwide.
                 Thus, in this necessarily brief description of the
                 different technologies we mention those in which the
                 IBM role was particularly noteworthy, with specific
                 mention of machines which brought the technologies to
                 the marketplace.",
  acknowledgement = ack-nhfb,
  classification = "722; 745",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; non-impact printing;
                 printing",
}

@Article{Lee:1984:TTE,
  author =       "M. H. Lee and J. E. Ayala and B. D. Grant and W.
                 Imaino and A. Jaffe and M. R. Latta and S. L. Rice",
  title =        "Technology Trends in Electrophotography",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "241--251",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Selected innovations and advances in
                 electrophotographic printing are reviewed.
                 Technological advances in photoreceptors, imaging
                 techniques, toner development and cleaning, fusing,
                 sensors, and new machine configurations and functions
                 are discussed with respect to their possible
                 applicability to future electrophotographic imaging
                 systems. In general, improvements in print quality and
                 reliability remain the main goals. In specific
                 applications, added functions and an increased range of
                 usable media are highly desired.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cleaning; computer peripheral equipment --- Printers;
                 electrophotographic printing; electrophotography;
                 fusing; imaging techniques; photography;
                 photoreceptors; print quality; printers; printing;
                 reliability; sensors; toner development",
  treatment =    "A Application; G General Review; P Practical",
}

@Article{Miller:1984:IIP,
  author =       "R. C. {Miller, Jr.}",
  title =        "Introduction to the {IBM 3800} Printing Subsystem
                 Models 3 and 8",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "252--256",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The IBM 3800 Printing Subsystem Models 3 and 8 are
                 high-speed, non-impact, electrophotographic printers
                 which are designed for system printing, text, and
                 graphics applications requiring flexibility and high
                 print quality. Features such as their print density of
                 240 multiplied by 240 pels\slash in**2 and all-point
                 addressability extend substantially their printing
                 capabilities beyond those of the Models 1 and 2.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "all-point addressability; computer peripheral
                 equipment; electrophotographic printers;
                 electrophotography; flexibility; graphics; IBM 3800;
                 IBM 3800 printing subsystem; print density; print
                 quality; printers; printing subsystems; system
                 printing; text",
  treatment =    "N New Development; P Practical",
}

@Article{McMurtry:1984:TIP,
  author =       "David McMurtry and Mike Tinghitella and Roger
                 Svendsen",
  title =        "Technology of the {IBM 3800} Printing Subsystem Model
                 3",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "257--262",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "IBM has introduced the 3800 Model 3
                 electrophotographic printer, which is a modified
                 version of the previously developed Model 1. The Model
                 3 improves the print density of the 3800 Model 1 from
                 180 multiplied by 144 pels\slash in. **2 to 240
                 multiplied by 240 pels\slash in. **2 and permits each
                 pel to be addressed individually. The laser print head
                 was modified to create the higher density by using the
                 same laser, focusing to a smaller spot size, slowing
                 down the speed of the rotating mirror, and developing a
                 dual-beam system. Beam-power balance and beam
                 separation were selected for optimum print quality. The
                 dual-beam print head required the development of a new
                 photoconductor with improved sensitivity. That
                 photoconductor also displayed a significantly increased
                 lifetime. Improved manufacturing techniques were
                 developed to reduce photoconductor defects. A digital
                 voltmeter and a new processor were introduced that
                 reduced the cost of the process servos by eliminating
                 previously hard-wired elements.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; density; digital
                 voltmeter; dual-beam; electrophotography; IBM 3800;
                 laser print head; laser printers; Model 3
                 electrophotographic printer; photoconductor; print;
                 print quality; printing subsystem model three; rotating
                 mirror; system",
  treatment =    "N New Development; P Practical",
}

@Article{Barrera:1984:EPC,
  author =       "C. Barrera and A. V. Strietzel",
  title =        "Electrophotographic Printer Control as Embodied in the
                 {IBM 3800} Printing Subsystem Models 3 and 8",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "263--275",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Control of the IBM 3800 Models 3 and 8
                 electrophotographic printers is achieved by use of a
                 fundamentally different control system than was used in
                 their predecessors, the Models 1 and 2. As a result,
                 printing of composed pages or electronic overlays can
                 include text of many different font sizes and styles
                 printed in multiple orientations, as well as raster
                 images up to a full page in size. The printers manage
                 stored resources, including fonts, segments of pages,
                 and electronic overlays. Pages are composed inside the
                 printers in a logical sequence, instead of by the more
                 traditional line-by-line sequence. This, as well as the
                 capability to position text and images at any
                 addressable point, enhances usability. A high-speed,
                 table-driven character generator, a new command set,
                 and a microcoded control unit make all of this
                 possible.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "command; composed pages; computer peripheral
                 equipment; control system; electronic overlays;
                 electrophotographic printers; electrophotography; font
                 sizes; IBM 3800; images; microcoded control unit;
                 photography; printers; printing --- Control Systems;
                 raster; set; table-driven character generator;
                 usability",
  treatment =    "N New Development; P Practical",
}

@Article{Crawford:1984:PQM,
  author =       "J. L. Crawford and C. D. Elzinga and R. Yudico",
  title =        "Print Quality Measurements for High-Speed
                 Electrophotographic Printers",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "276--284",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Described here are some of the characteristics that
                 make electrophotographic printing esthetically
                 pleasing, and the use of a recently developed
                 computer-controlled scanner for measuring those
                 characteristics. New print quality measurements are
                 described (for example, measurements of modulation,
                 image gray-scale fidelity, and tangential-edge
                 roughness) that allow the monitoring of the advanced
                 printing functions made possible by all-point
                 addressability. The requirements for the implementation
                 of the scanner are discussed. Also discussed are the
                 effects and limitations on print quality measurement
                 resolution imposed by the algorithms used and the
                 scanner; the effect of light scatter by the paper; and
                 the usefulness of the print quality measurements as an
                 aid in making design trade-off decisions and in
                 manufacturing control.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "all-point addressability; computer peripheral
                 equipment; computer-controlled; electrophotography;
                 functions; high-speed electrophotographic printers;
                 image gray-; light scatter; measurement resolution;
                 modulation; photography; print quality measurements;
                 printers; printing; scale fidelity; scanner;
                 tangential-edge roughness",
  treatment =    "P Practical; X Experimental",
}

@Article{Borch:1984:PMC,
  author =       "J. Borch and R. G. Svendsen",
  title =        "Paper Material Considerations for System Printers",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "285--291",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Laser printing of continuous forms by means of
                 electrophotographic imaging requires that the paper on
                 which the printing is carried out show good handling
                 characteristics at fast machine speeds and be
                 compatible with toner transfer and fixing. Toner
                 transfer requires suitable electrical paper
                 characteristics, similar to those of xerographic cut
                 sheets intended for use in electrophotographic
                 cut-sheet copiers and printers. Hot-pressure fusing in
                 the IBM 3800 printing subsystem has been shown to
                 require adequate paper-fiber wettability by the hot
                 molten toner. Therefore, characteristics of paper
                 chemistry, and in particular paper sizing, are
                 essential in creating good image fixing (fusing). In
                 addition, the temperature and pressure in the fusing
                 assembly affect the thermal and dimensional stability
                 of the paper. For the 3800, this necessitated
                 modifications in roll design within the fusing station
                 in order to ensure satisfactory paper handling.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; electrophotographic
                 imaging; electrophotography; fixing; fusing station;
                 handling characteristics; hot-pressure fusing; IBM
                 3800; laser printers; laser printing; paper ---
                 Printing Properties; paper chemistry; paper handling;
                 paper sizing; printing; roll design; system printers;
                 toner; transfer",
  treatment =    "P Practical",
}

@Article{Baumann:1984:FFE,
  author =       "Gerald W. Baumann",
  title =        "Flash Fusing in Electrophotographic Machines",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "292--299",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A theoretical model of the flash fusing process for
                 electrophotographic machines was developed using the
                 joint solution of a nonlinear circuit equation and the
                 one-dimensional thermal diffusion equation. Numerous
                 experiments were run using different toners according
                 to the size of toner particles and the pulse width in
                 order to determine the minimum energy that was required
                 for fusing. The experiments confirm that this model
                 predicts reasonably well what was observed in the lab.
                 The melt depth required for good fusing is slightly
                 less than mean particle size. At that depth the
                 temperature is somewhat greater than the temperature
                 required in the nip of a hot roll fuser for the same
                 toner. Under typical flash fusing, the top surface of
                 the toner is subjected to considerably higher
                 temperatures than the melt temperature of the toner.
                 From the combined analytical and experimental results,
                 the proper compromises can be made for efficiency and
                 volatiles.",
  acknowledgement = ack-nhfb,
  classcodes =   "B5180D (Electrostatic devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; electrophotographic
                 machines; electrophotography; flash; flash fusing;
                 fusing process; melt depth; nonlinear circuit equation;
                 one-dimensional; printing; pulse width; theoretical
                 model; thermal diffusion equation; toners",
  treatment =    "X Experimental",
}

@Article{Darling:1984:MIJ,
  author =       "Richard H. Darling and Chen-Hsiung Lee and Lawrence
                 Kuhn",
  title =        "Multiple-Nozzle Ink Jet Printing Experiment",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "300--306",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An experimental printer is described which utilizes a
                 densely packed array of ink jets operated in a binary,
                 pressurized, asynchronous mode. The printer
                 configuration, the ink jet head structure, the
                 operating point, and the maintenance approach are all
                 discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745; 804",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "asynchronous mode; computer peripheral equipment ---
                 Printers; densely packed array; head structure; ink;
                 ink jet printers; ink jet printing; ink jets; operating
                 point; printer; printing",
  treatment =    "X Experimental",
}

@Article{Lee:1984:ADI,
  author =       "F. C. Lee and R. N. Mills and F. E. Talke",
  title =        "Application of Drop-On-Demand Ink Jet Technology to
                 Color Printing",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "307--313",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The application of drop-on-demand ink jet technology
                 to high-frequency and high-resolution color printing is
                 investigated using an experimental multi-nozzle print
                 head. Cross talk and drop misregistration are examined
                 as a function of drop ejection frequency. Typical print
                 samples from scanned and computer-generated data are
                 obtained and the dependence of print quality on various
                 parameters such as drop ejection frequency, ink
                 composition, and paper quality is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "color; computer peripheral equipment --- Printers;
                 computer-generated data; crosstalk; drop; drop
                 misregistration; drop-on-demand ink jet technology;
                 ejection frequency; ink composition; ink jet printers;
                 ink jet printing; multinozzle print head; paper
                 quality; print quality; printing",
  treatment =    "N New Development; P Practical",
}

@Article{Bogy:1984:ETS,
  author =       "D. B. Bogy and F. E. Talke",
  title =        "Experimental and Theoretical Study of Wave Propagation
                 Phenomena in Drop-On-Demand Ink Jet Devices",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "314--321",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents experimental observations and a
                 theoretical analysis of the operation of drop-on-demand
                 piezoelectric ink jet devices. By studying
                 experimentally the dependence of several operating
                 characteristics on the length of the cavity in the
                 nozzle of an ink jet device, we have gained insight
                 into the physical phenomena underlying the operation of
                 such a device. It is concluded that drop-on-demand ink
                 jet phenomena are related to the propagation and
                 reflection of acoustic waves within the ink jet cavity.
                 A simple analysis is carried out on the basis of linear
                 acoustics which is in good agreement with the
                 experimental observations.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "714; 745; 751; 804",
  corpsource =   "IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acoustic wave propagation; acoustic waves; acoustic
                 waves --- Propagation; cavity; drop ejection;
                 drop-on-demand ink jet devices; ink; ink jet devices;
                 ink jet printers; linear acoustics; operating
                 characteristics; piezoelectric devices; piezoelectric
                 ink jet; printing; wave propagation",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Fromm:1984:NCF,
  author =       "J. E. Fromm",
  title =        "Numerical Calculation of the Fluid Dynamics of
                 Drop-On-Demand Jets",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "3",
  pages =        "322--333",
  month =        may,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A numerical method that makes use of the complete
                 incompressible flow equations with a free surface is
                 discussed and used to study an impulsively driven
                 laminar jet. Flow behavior dependence upon fluid
                 properties (characterized by a Reynolds number over
                 Weber number nondimensionalization) is compared for
                 drop integrity purposes. Several variations of square
                 wave pressure history applied at a nozzle inlet are
                 discussed in relation to drop velocities produced and
                 structure of ejected drops. Timewise development of
                 flow both interior and exterior to the nozzle is
                 illustrated through computed contour sequences.",
  acknowledgement = ack-nhfb,
  classification = "632; 745; 804",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "fluidics; ink; ink jets; printing",
}

@Article{Tryon:1984:SFA,
  author =       "D. R. Tryon and F. M. Armstrong and M. R. Reiter",
  title =        "Statistical Failure Analysis of System Timing",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "340--355",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Techniques are developed that quantify the probability
                 that large computer systems will meet their cycle time
                 objectives. Both approximation techniques and rigorous
                 multivariate statistical techniques are described. A
                 method is developed that enumerates the cycle-limiting
                 paths so that these approaches can be utilized. The
                 results of these techniques enable system designers to
                 ensure that performance and reliability objectives are
                 met.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140Z (Other topics in statistics); C5420 (Mainframes
                 and minicomputers); C5470 (Performance evaluation and
                 testing)",
  classification = "722; 723; 922",
  corpsource =   "Div. of Data Syst., IBM, Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approximation techniques; computer systems, digital;
                 cycle time; cycle-limiting paths; failure analysis;
                 large computer systems; mainframes; multivariate;
                 performance evaluation; reliability; statistical
                 analysis; statistical failure analysis; statistical
                 methods; statistical techniques; system timing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Flynn:1984:MIE,
  author =       "Michael J. Flynn and Lee W. Hoevel",
  title =        "Measures of Ideal Execution Architectures",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "356--369",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is a study in ideal computer architectures
                 or program representations. We define measures of
                 `ideal' architectures that are related to the
                 higher-level representation used to describe a program
                 at the source language level. Canonic interpretive (CI)
                 measures are developed. CI measures apply to both the
                 space needed to represent a program and the time needed
                 to interpret it. Example-based CI measures are
                 evaluated for a variety of contemporary architectures,
                 both host-and language-oriented, as well as CI-derived
                 language-oriented architecture.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C5470 (Performance
                 evaluation and testing); C6140D (High level
                 languages)",
  classification = "722; 723",
  corpsource =   "Dept. of Electr. Eng., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "architectures; behavior; canonic interpretive
                 measures; computer architecture; computer
                 architectures; evaluation; execution architectures;
                 high level languages; ideal execution;
                 language-oriented architecture; performance; program;
                 representations; source language level; statistical",
  treatment =    "P Practical",
}

@Article{Correale:1984:DCS,
  author =       "A. Correale",
  title =        "Design Considerations of a Static {LSSD} Polarity Hold
                 Latch Pair",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "370--378",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Oct 25 10:36:51 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "There are many considerations relating to the design
                 of a static LSSD polarity hold latch pair. High
                 performance, low power dissipation, small size, and
                 stability are some of the major requirements for a good
                 design. The engineering trade-offs needed to ensure
                 that all goals are met are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); C5120 (Logic and switching
                 circuits)",
  classification = "721",
  corpsource =   "Div. of Commun. Products, IBM, Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "flip-flops; level sensitive scan design; logic
                 circuits; logic design; LSSD polarity hold latch pair;
                 power dissipation; sequential circuits; stability;
                 static; static LSSD polarity hold latch pair",
  treatment =    "P Practical",
}

@Article{Matick:1984:APA,
  author =       "Richard Matick and Daniel T. Ling and Satish Gupta and
                 Frederick Dill",
  title =        "All Points Addressable Raster Display Memory",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "379--392",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses display designs which store the
                 image point by point in random access memory, so that
                 independent update of every pixel is possible. A
                 frequent bottleneck in the design of high performance
                 displays of this type is the available bandwidth of the
                 memory subsystem. In this paper, we focus on this issue
                 and present features of a customized dynamic RAM chip
                 which can readily provide the necessary bandwidth and
                 thus greatly simplify the design of very high
                 performance APA raster scan displays. The customized
                 RAM chip is quasi-two-ported. After briefly introducing
                 APA raster displays, we discuss display memory system
                 design and the design of the proposed custom memory
                 chip. We describe the second port for the video
                 refresh, which makes the primary port available for
                 update almost continuously.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2360 (Electron beam scanned
                 tubes)B7260 (Display technology and systems)",
  classification = "721; 722; 723",
  corpsource =   "Div. of Res., IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "all points addressable raster display memory; APA;
                 cathode-ray tube displays; data storage, digital;
                 display devices; display instrumentation; display
                 memory; dynamic RAM chip; high; integrated memory
                 circuits; performance; performance displays; primary
                 port; random access memory; random-access storage;
                 raster display memory; system design; update; video
                 refresh",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Ostapko:1984:MMC,
  author =       "D. L. Ostapko",
  title =        "Mapping and Memory Chip Hardware Which Provides
                 Symmetric Reading\slash Writing of Horizontal and
                 Vertical Lines",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "393--398",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a mapping and memory chip
                 hardware for enhancing the performance of an APA
                 display. The approach describes a modification to the
                 primary port of a quasi-two-ported memory. This
                 modification allows several contiguous horizontal or
                 vertical bits to be read or written in one cycle. The
                 number of bits that can be stored is given by the
                 number of memory chips. The hardware modifications can
                 be on or off chip, and if on chip, the chip can still
                 be used as a conventional memory chip. Simple
                 modifications to the hardware will support different
                 screen sizes.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2360 (Electron beam scanned
                 tubes)B7260 (Display technology and systems)",
  classification = "721; 722; 723",
  corpsource =   "Div. of Res., IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APA display; cathode-ray tube displays; chip hardware;
                 data storage, digital; display devices; display
                 instrumentation; integrated memory circuits; mapping;
                 mapping and memory chip hardware; memory; memory chip;
                 primary port; quasi-two-ported; random-access storage;
                 semiconductor storage; symmetric reading/writing;
                 symmetric reading/writing of horizontal and vertical
                 lines; vertical lines",
  treatment =    "N New Development; P Practical",
}

@Article{Dave:1984:RRN,
  author =       "J. V. Dave and Jeno Gazdag",
  title =        "Reduction of Random Noise from Multiband Image Data
                 Using Phase Relationships Among Their {Fourier}
                 Coefficients",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "399--411",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is shown that, in general, the addition of random
                 noise results in the rapid change, with frequency, of a
                 quantity called the coherency measure. (This is a
                 quantitative measure of the phase agreement among the
                 phases of various Fourier coefficients at a given
                 frequency). The coherency measure vs. frequency curve
                 for a given data line is then used to attenuate various
                 Fourier coefficients of the corresponding nearby bands
                 of that line. It is then shown that the inverse
                 transformation of such modified Fourier coefficients
                 results in a statistically significant reduction of
                 noise from the data of single lines, or from those data
                 of some finite areas of the image. Results of a
                 supervised boxcar multispectral classification with the
                 original as well as various modified data sets of the
                 selected image are also presented to provide additional
                 guidance in use of such a sophisticated analytic
                 procedure in image processing.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723; 921; 922",
  corpsource =   "Acad. Inf. Syst., IBM, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boxcar multispectral; classification; coherency
                 measure; data; Fourier analysis; Fourier coefficients;
                 frequency domain; image processing; multiband image
                 data; noise, spurious signal; phase relationships;
                 picture processing; pixel value; random noise; sets;
                 spatial domain; statistically significant; terrestrial
                 scene",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Orth:1984:EAE,
  author =       "D. L. Orth",
  title =        "Empty Arrays in Extended {APL}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "412--427",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "547.68010",
  abstract =     "During the past several years considerable work has
                 been done on extending APL in three areas: operators,
                 heterogeneous data, and nested data. In each area a
                 proposed extension must treat empty arrays
                 consistently. In this paper various possibilities for
                 providing consistent behavior are presented. The new
                 proposals possess at least one of two important
                 qualities in which older proposals tend to be
                 deficient: consistent behavior is independent of the
                 structural properties of rank and nesting, and the user
                 has control over the behavior when he wants it.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages)",
  classification = "723",
  corpsource =   "Div. of Res., IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL; apl language; computer programming languages;
                 empty arrays; extended APL; heterogeneous data; nested
                 data; operators; parallel processing; rank",
  treatment =    "P Practical",
}

@Article{Ohba:1984:SRA,
  author =       "Mitsuru Ohba",
  title =        "Software Reliability Analysis Models",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "428--443",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses improvements to conventional
                 software reliability analysis models by making the
                 assumptions on which they are based more realistic. In
                 an actual project environment, sometimes no more
                 information is available than reliability data obtained
                 from a test report. The models described here are
                 designed to resolve the problems caused by this
                 constraint on the availability of reliability data. By
                 utilizing the technical knowledge abut a program, a
                 test, and test data, we can select an appropriate
                 software reliability analysis model for accurate
                 quality assessment. The delayed S-shaped growth model,
                 the inflection S-shaped model, and the hyperexponential
                 model are proposed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming)",
  classification = "723; 922",
  corpsource =   "Sci. Inst., IBM Japan Ltd., Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer software; delayed S-shaped growth;
                 environment; hyperexponential model; inflection
                 S-shaped model; model; project; quality assessment;
                 reliability analysis models; software reliability",
  treatment =    "P Practical",
}

@Article{Hopner:1984:DDE,
  author =       "E. Hopner and M. A. Patten",
  title =        "Digital Data Exchange --- a Space-Division Switching
                 System",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "444--453",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The user requirements for an automated switch for
                 computer terminals in a large establishment or
                 laboratory environment are discussed. This is followed
                 by an explanation of the design requirements, and
                 finally by a description of the significant features of
                 the digital data exchange (DDEX), a
                 microprocessor-controlled user-transparent
                 space-division digital data switch of modular design
                 which is capable of connecting 512 to 2048 lines from
                 various types of IBM terminals to different control
                 units, thereby substantially saving interconnection
                 resources.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); B6230Y (Other
                 switching centres); C3370G (Control applications in
                 data transmission); C5620 (Computer networks and
                 techniques); C7420 (Control engineering computing)",
  classification = "722; 723",
  corpsource =   "IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated switch; computer networks; computer
                 terminals; computers --- Data Communication Equipment;
                 control units; data communication systems; DDEX;
                 digital data exchange; digital data switch; electronic;
                 IBM terminals; microprocessor-controlled
                 user-transparent space-division; requirements;
                 space-division switching system; switching systems;
                 user",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Gillespie:1984:RPC,
  author =       "Sherry J. Gillespie",
  title =        "Resist Profile Control in {E-Beam} Lithography",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "454--460",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Imaging studies have confirmed that a desired resist
                 profile can be obtained by selecting the appropriate
                 combination of process parameters: dose, interrupted
                 development, pattern bias, and resist thickness. Bias
                 sensitivity of the resist image to process parameters
                 was measured using a positive diazo resist with
                 nonlinear development characteristics on an IBM EL-3
                 E-beam tool. Because of superior bias stability,
                 top-edge imaging with undercut profiles in a
                 single-layer resist was found to provide many of the
                 imaging advantages of a multilayer system. Sufficient
                 resolution and image quality are obtained to extend the
                 application of a single-layer resist system to 1-$\mu$m
                 lithography.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2550G
                 (Lithography)",
  classification = "711; 713; 745",
  corpsource =   "Div. of Gen. Technol., IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "dose; E-beam lithography; e-beam lithography; edge
                 imaging; electron beams; electron resists; IBM EL-3
                 E-beam tool; image quality; integrated circuit
                 manufacture; interrupted development; lithography ---
                 Applications; pattern bias; positive diazo resist;
                 process parameters; resist; resist profile; resist
                 profile control; resist system; semiconductor
                 technology; single-layer; thickness; top-; undercut
                 profiles",
  treatment =    "P Practical",
}

@Article{Stapper:1984:MDI,
  author =       "C. H. Stapper",
  title =        "Modeling of Defects in Integrated Circuit
                 Photolithographic Patterns",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "461--475 (or 461--474??)",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a previous paper by the same author the foundation
                 was laid for the theory of photolithographic defects in
                 integrated circuits. This paper expands on the earlier
                 one and shows how to calculate the critical areas and
                 probability of failure for dense arrays of wiring. The
                 results are used to determine the nature of the defect
                 size distribution with electronic defect monitors.
                 Several statistical techniques for doing this are
                 described and examples are given.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240Z (Other topics in statistics); B2220C (General
                 integrated circuit fabrication techniques)",
  classification = "713; 745; 922",
  corpsource =   "Div. of Gen. Technol., IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "areas; critical; defect modeling; defect size; dense
                 arrays; distribution; electronic defect monitors;
                 failure; failure analysis; integrated circuit
                 manufacture; integrated circuit photolithographic
                 patterns; integrated circuit technology; lithography
                 --- Applications; photolithography; statistical;
                 techniques; wiring",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Held:1984:ATS,
  author =       "M. Held and A. J. Hoffman and E. L. Johnson and P.
                 Wolfe",
  title =        "Aspects of the Traveling Salesman Problem",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "476--486",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B10",
  MRnumber =     "85h:90046",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "558.90067",
  abstract =     "For fifty years the traveling salesman problem has
                 fascinated mathematicians, computer scientists, and
                 laymen. It is easily stated, but hard to solve; it has
                 become the prototypical hard problem in theoretical
                 computer science. A large part of the extensive
                 research conducted by IBM in the broad area of
                 optimization, or mathematical programming, contributed
                 to or was inspired by aspects of this challenging
                 problem. This article reviews some of that work as well
                 as recent developments in techniques that were used on
                 the largest traveling salesman problem ever solved.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1180 (Optimisation techniques); C1290 (Applications
                 of systems theory)",
  classification = "912; 921",
  corpsource =   "Acad. Inf. Syst., IBM, White Plains, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "combinatorial problems; heuristic methods;
                 mathematical programming; operations research;
                 optimisation; optimization; permutations; traveling
                 salesman problem",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Langdon:1984:EIA,
  author =       "Glen G. {Langdon, Jr.}",
  title =        "Erratum: {``An introduction to arithmetic coding''}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "4",
  pages =        "498--498",
  month =        jul,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A29",
  MRnumber =     "85h:94016b",
  bibdate =      "Sat Feb 24 09:36:11 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Langdon:1984:IAC}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Taylor:1984:SAM,
  author =       "Richard L. Taylor",
  title =        "Software Architecture for a Mature Design Automation
                 System",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "501--511",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The software structure portion of an architecture for
                 a design automation system is described; interactive
                 and foreground design applications are stressed. The
                 structure involves a uniform set of services, such as
                 command languages and terminal access methods, needed
                 to support the design application, and a formal,
                 two-part partitioning of the design application itself.
                 Modularity and good interfaces are important parts of
                 the software structure which permit a development
                 laboratory to change the application enough for it to
                 be easily used.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7410D (Electronic engineering computing)",
  classification = "723",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automation system; CAD; command languages; computer
                 aided design; computer architecture; computer software;
                 design; distributed data; distributed processing;
                 electronic design; electronic engineering computing;
                 IBM; interfaces; method; software architecture;
                 terminal access",
  treatment =    "P Practical",
}

@Article{Capelli:1984:DIG,
  author =       "Ronald B. Capelli and George C. Sax",
  title =        "A device-independent graphics package for {CAD}
                 applications",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "512--523",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "GSSP (Graphics Support Subroutine Package) is a
                 device-independent two-dimensional graphics package
                 developed by Engineering Design System (EDS) to support
                 several major electronic and mechanical computer-aided
                 design applications within IBM. Graphics systems
                 supported range from interactive, high-function,
                 distributed-graphics workstations to passive
                 graphic-output devices. GSSP provides many of the
                 functions usually found in other device-independent
                 graphics packages, with additional support for
                 hierarchically structured display files and distributed
                 graphics systems. The major functions provided by GSSP
                 are described, and an overview of the implementation is
                 presented to show how issues such as interactive
                 performance and human factors are addressed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130B (Graphics techniques); C7410D (Electronic
                 engineering computing); C7440 (Civil and mechanical
                 engineering computing)",
  classification = "723",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; CAD applications; computer aided design; computer
                 graphics; device-independent two-; dimensional graphics
                 package; distributed-graphics workstations; electronic
                 CAD; electronic engineering computing; Engineering
                 Design Systems; graphics support subroutine package;
                 Graphics Support Subroutine Package; GSSP;
                 hierarchically structured display files; human factors;
                 IBM; interactive performance; mechanical CAD;
                 mechanical engineering computing; output devices;
                 passive graphic-; software packages",
  treatment =    "A Application; P Practical",
}

@Article{Alvarodiaz:1984:ISV,
  author =       "Rita R. Alvarodiaz and Walter H. Elder and Peter P.
                 Zenewicz",
  title =        "An interactive system for {VLSI} chip physical
                 design",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "524--536",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Federal Systems Division has developed a
                 structured design methodology and a companion chip
                 physical design system that has been used to build
                 seven large VLSI chips (ranging in size from 7K to 36K
                 logic primitives). Using the MVISA system, a logic
                 designer has complete control and responsibility for
                 the total chip design. The authors experience has been
                 that when this highly interactive software and
                 methodology is used, chip physical design requires less
                 than two weeks. This is a significant savings in design
                 time; but more importantly the designer can allocate
                 more schedule for logic design and simulation. This
                 paper describes how FSD's unique interactive physical
                 design system has improved productivity of VLSI
                 design.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); C5210B
                 (Computer-aided logic design); C7410D (Electronic
                 engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Federal Syst. Div., Masassas, VA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit CAD; computer aided design; computer software;
                 Federal; IBM; integrated circuits, VLSI --- Design;
                 interactive system; interactive systems; logic CAD;
                 logic design; MVISA; productivity; simulation;
                 structured design methodology; system; Systems
                 Division; VLSI; VLSI chip physical design",
  treatment =    "P Practical",
  xxauthor =     "W. H. Elder and P. P. Zenewicz and R. R. Alvarodiaz",
}

@Article{Darringer:1984:LSP,
  author =       "John A. Darringer and Daniel Brand and John V. Gerbi
                 and William H. {Joyner, Jr.} and Louise Trevillyan",
  title =        "{LSS}: a System for Production Logic Synthesis",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "537--545",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the evolution of the Logic
                 Synthesis System from an experimental tool to a
                 production system for the synthesis of masterslices
                 chip implementations. The system was used by one
                 project in IBM Poughkeepsie to produce 90 percent of
                 its more than one hundred chip parts. The primary
                 reasons for this success are the use of local
                 transformations to simplify logic representations at
                 several levels of abstraction, and a highly cooperative
                 effort between logic designers and synthesis system
                 designers to understand the logic design process
                 practiced in Poughkeepsie and to incorporate this
                 knowledge into the synthesis system.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265 (Digital electronics); C5210B (Computer-aided
                 logic design); C7410D (Electronic engineering
                 computing)",
  classification = "721; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; computer aided design; IBM; local; logic CAD;
                 logic design; logic representations; logic synthesis;
                 logic synthesis system; Logic Synthesis System; LSS;
                 masterslice chip implementations; production; system;
                 transformations",
  treatment =    "P Practical",
}

@Article{Gilkinson:1984:ATM,
  author =       "James L. Gilkinson and Amir Hekmatpour and Steven D.
                 Lewis and Bruce B. Winter",
  title =        "Automated Technology Mapping",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "546--556",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Motivated initially by the problem of test case
                 generation for new technologies, a logic transformation
                 system, known as the Technology Mapping System (TMS),
                 was developed. This system has focused on the problem
                 of technology-to-technology mapping involving gate
                 array or standard cell logic families. TMS makes use of
                 an intermediate notation, called GLN, and uses several
                 forms of `rules' to control the mapping process. This
                 paper discusses the history and general operation of
                 TMS, and makes a comparison of transformations from
                 different types of sources.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); C5210B (Computer-aided logic
                 design)C7410D (Electronic engineering computing)",
  classification = "721; 723",
  corpsource =   "IBM Syst. Products Div., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "array; cellular arrays; computer aided design; gate;
                 high-level design language; logic CAD; logic design;
                 logic mapping; logic transformation system; standard
                 cell logic families; Technology Mapping System;
                 technology mapping system; TMS; transformation",
  treatment =    "P Practical",
  xxauthor =     "J. L. Gilkinson and S. D. Lewis and B. B. Winter and
                 A. Hekmatpour",
}

@Article{Maissel:1984:HDD,
  author =       "Leon I. Maissel and Hillel Ofek",
  title =        "Hardware Design and Description Languages in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "557--563",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Hardware design languages (HDLs) allow computer
                 hardware to be described in sufficient detail to be
                 simulated and built, such a description being at a
                 sufficiently high level of abstraction to make the
                 complete design readily intelligible to anyone skilled
                 in that language. A number of HDLs have been developed
                 and are in use in IBM. To date, no overwhelming case
                 can be made for choosing any one HDL over the others.
                 The major trends in HDL are discussed. Several examples
                 of HDLs are presented in some detail. VHDL, the
                 yet-to-be released HDL which is to serve as a front end
                 to the U. S. Government's Very High Speed Integrated
                 Circuits program, is among these.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C7410D (Electronic
                 engineering computing)",
  classification = "713; 722; 723",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer; computer programming languages; computers;
                 description languages; digital hardware; electronic
                 engineering computing; hardware; hardware design
                 languages; HDL; high level languages; IBM; integrated
                 circuits; VHDL",
  treatment =    "P Practical",
}

@Article{Barzilai:1984:UHS,
  author =       "Zeev Barzilai and Daniel K. Beece and Leendert M.
                 Huisman and Gabriel M. Silberman",
  title =        "Using a Hardware Simulation Engine for Custom {MOS}
                 Structured Designs",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "564--571",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Mixed-level simulation techniques are widely used in
                 VLSI designs for verification and test evaluation. This
                 paper indicates how to perform mixed-level simulation
                 on structured MOS designs using the Yorktown Simulation
                 Engine (YSE), a hardware simulator developed at IBM. On
                 the YSE, simulation can be done at the functional,
                 gate, and transistor levels. The design specification
                 used by the YSE is well suited for mixed-level
                 simulation, particularly with regard to interfacing the
                 different levels. Techniques are applied to an nMOS
                 design to show the important features of our
                 approach.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570F (Other MOS integrated circuits); C7410D
                 (Electronic engineering computing)",
  classification = "714; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit CAD; circuits; custom MOS structured designs;
                 digital simulation; Engine; field effect integrated;
                 functional level; gate level; hardware simulation
                 engine; IBM; integrated circuits, VLSI; mixed-level
                 simulation; NMOS design; semiconductor devices, MOS;
                 transistor level; VLSI; VLSI designs; Yorktown
                 Simulation; Yorktown Simulation Engine; YSE",
  treatment =    "P Practical",
}

@Article{Fiebrich:1984:PSL,
  author =       "Rolf-Dieter Fiebrich and Yuh-Zen Liao and George
                 Koppelman and Edward Adams",
  title =        "{PSI}: a Symbolic Layout System",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "572--580",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A symbolic layout tool, PSI, is described for use with
                 IBM circuit technology. Significant features of PSI are
                 used with multiple circuit technologies, adaptation to
                 rapid changes of technology design rules, creation of
                 nested designs, and extensive designer control over the
                 spacing process.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 C7410D (Electronic engineering computing)",
  classification = "713; 721; 723",
  corpsource =   "Thinking Machines Corp., Waltham, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit layout CAD; computer aided design; computers;
                 designer control; IBM circuit technology; integrated
                 circuits; multiple circuit technologies; nested
                 designs; PSI; spacing process; symbolic layout;
                 symbolic layout system; technology design rules",
  treatment =    "P Practical",
  xxauthor =     "R.-D. Fierich and Y.-Z. Liao and G. Koppelman and E.
                 Adams",
}

@Article{Cook:1984:CSG,
  author =       "Peter W. Cook",
  title =        "Constraint Solver for Generalized {IC} Layout",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "581--589",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The essential features of the constraint solver, which
                 is intended to place few restrictions on the source of
                 the constraints to be solved, are that it accommodate
                 mixed equality and inequality constraints, that it
                 allow selective `maximization' of variables, that it
                 proceed with any number of variables given user-defined
                 values, and that it fail to produce a solution only
                 when no solution exists. These features all flow from
                 the desire to provide a constraint solver suitable for
                 use in an `open' system, in which there are no
                 restrictions on the form or order of the constraints.
                 The algorithm presented meets these objectives while
                 remaining reasonable in its use of storage and time.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); C7410D
                 (Electronic engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; circuit layout CAD; computer aided design;
                 constraint solver; equality constraints; inequality
                 constraints; integrated circuits; layout system; open;
                 selective variable maximisation; symbolic IC layout
                 system; system",
  treatment =    "P Practical",
}

@Article{Barone:1984:CCC,
  author =       "A. M. Barone and J. K. Morrell",
  title =        "{Custom Chip\slash Card Design System}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "590--595",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Custom Chip\slash Card Design System (CCDS) is a
                 set of software applications, tied together via a
                 common data interchange, that is used for the design,
                 analysis, and checking of custom electronic circuits.
                 CCDS is intended to unite the separate electrical,
                 logical, and physical design phases and a single design
                 process. The underlying principle of the system rests
                 on the idea of describing the product as a generalized
                 network, with multiple overlapping views that
                 correspond to the different design phases. In addition
                 to the applications contained within CCDS, there are
                 also links to other software tools for such things as
                 circuit simulation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 C7410D (Electronic engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic testing; CCDS; circuit analysis; circuit
                 CAD; circuit checking; circuit design; circuit
                 simulation; common data interchange; computer aided
                 design; computer simulation; computer software; Custom
                 Chip/Card Design; custom chip/card design system;
                 custom electronic circuits; electrical design;
                 electronic circuits; generalized; logical design;
                 multiple overlapping views; network; physical design;
                 software applications; System",
  treatment =    "P Practical",
}

@Article{Hauge:1984:ASC,
  author =       "Peter S. Hauge and Ellen J. Yoffa",
  title =        "{ACORN}: a System for {CVS} Macro Design by Tree
                 Placement and Tree Customization",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "596--602",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "ACORN is a system for the physical design of cascade
                 voltage switch (CVS) macros which utilizes tree
                 placement and tree customization to improve macro
                 wirability. The results obtained by designing a 43-tree
                 differential (DCVS) macro on a masterslice chip image
                 are presented to illustrate the design improvements. In
                 this example, tree placement reduces wire length and
                 via count by 12 percent relative to a transistor-pair
                 placement design. Tree customization increases this
                 improvement to 25 percent, and increases the porosity
                 of the wired macro to vertical global wires from 8
                 percent for tree placement alone to 15 percent.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); C5210B (Computer-aided logic
                 design)C7410D (Electronic engineering computing)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(mathematics); acorn; ACORN; cascade voltage switch;
                 cascode voltage switch macros; cellular arrays;
                 computer aided design; differential macro; integrated
                 logic circuits; logic CAD; macro; macro design;
                 masterslice chip image; physical design; placement;
                 porosity; tree; tree customization; trees; vertical
                 global wires; via count; wirability; wire length",
  treatment =    "P Practical",
}

@Article{Elmendorf:1984:KMU,
  author =       "Peter C. Elmendorf",
  title =        "{KWIRE}: a Multiple-Technology, User-Reconfigurable
                 Wiring Tool for {VLSI}",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "603--612",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a VLSI design environment where a range of chip
                 technologies are available and concurrent chip designs
                 are commonplace, it is not feasible to build a wiring
                 program for each technology. Additionally, a chip's
                 design methodology may demand specific abilities from a
                 wiring program. KWIRE was developed to meet the needs
                 of a multiple-technology, multiple-methodology VLSI
                 design community. It has been used on a range of chips,
                 from small designs to custom microprocessors. Modeling
                 the users' designs and design rules in geometric terms
                 allows KWIRE to handle such a diversity of chip
                 designs. This paper describes the KWIRE system and
                 router.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); C7410D
                 (Electronic engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Commun. Products Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated wire routing; chip; circuit layout CAD;
                 custom microprocessors; design; design methodology;
                 integrated circuits, VLSI; KWIRE; multiple technology
                 user reconfigurable wiring tool; rule modelling;
                 technologies; VLSI; VLSI design; wiring program",
  treatment =    "P Practical",
}

@Article{Linsker:1984:IPW,
  author =       "Ralph Linsker",
  title =        "Iterative-Improvement Penalty-Function-Driven Wire
                 Routing System",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "613--624",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes some features of a wire routing
                 system (VIKING) that has been developed for
                 interconnection packages, and discusses related
                 strategies for improving wiring density and quality on
                 chips and packages. The routing problem for a chip or
                 interconnection package consists of finding a `legal'
                 set of paths that accomplishes the required
                 interconnections. An iterative improvement strategy,
                 generates an initial wiring configuration which is
                 successively improved by optimizing the routing, one
                 connection at a time, with respect to a sequence of
                 penalty functions. Illegal intermediate wiring
                 configurations are permitted.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2210B (Printed circuit layout and design); B2570
                 (Semiconductor integrated circuits); C7410D (Electronic
                 engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chip design; circuit layout CAD; directionally
                 uncommitted planes; electrical crosstalk noise;
                 embedding effort; functions; global optimization;
                 integrated circuits; interconnection packages;
                 iterative-improvement methods; manual; penalty; routed
                 wire length; signal planes; vias; VIKING; Viking
                 system; wire crossings; wire routing; wire routing
                 system",
  treatment =    "P Practical",
}

@Article{Leet:1984:CLT,
  author =       "D. Leet and P. Shearon and R. France",
  title =        "A {CMOS LSSD} test generation system",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "625--635",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Automatic test pattern generators based on the
                 stuck-fault concept are theoretically inadequate in
                 their ability to generate test patterns for CMOS
                 circuits. A new set of pin faults, called CMOS faults,
                 is discussed that can represent the necessary test
                 pattern sequences for these circuits. Processing of
                 these faults by a new test pattern generator, called
                 the Enhanced Test Generator (ETG), is also described.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570D (CMOS integrated circuits); C7410D (Electronic
                 engineering computing)",
  classification = "713; 723",
  corpsource =   "IBM Gen. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic test pattern generators; automatic testing;
                 circuit analysis computing; CMOS; CMOS faults; CMOS
                 LSSD test generation; enhanced test generator; Enhanced
                 Test Generator; integrated circuit testing; integrated
                 circuits; pin faults; stuck-fault; stuck-fault concept;
                 system",
  treatment =    "P Practical",
}

@Article{Stapper:1984:YMF,
  author =       "Charles H. Stapper",
  title =        "Yield Model for Fault Clusters Within Integrated
                 Circuits",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "5",
  pages =        "636--640",
  month =        sep,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Generalized negative binomial statistics turns out to
                 be a model of the fault distribution in very large
                 chips are wafers with internal defect clusters. This is
                 expected to influence large chip and full wafer
                 redundancy requirements. Furthermore, the yield appears
                 to be affected by an experimental dependence of the
                 average number of faults on chip area.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240 (Probability and statistics); B2570
                 (Semiconductor integrated circuits)",
  classification = "713; 921",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binomial statistics; fault clusters; fault
                 distribution; fault location; integrated circuit
                 testing; integrated circuits; internal defect clusters;
                 monolithic IC; monolithic integrated circuits;
                 negative; redundancy; statistical analysis; very large
                 chips; wafers; yield; yield model",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Seraphim:1984:PAM,
  author =       "Donald P. Seraphim and Patrick A. Toole and William T.
                 Chen and Robert Rosenberg",
  title =        "Preface: Advances in Materials and Processes for
                 Printed Circuit Packaging Technology",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "652--654",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The foundation of advanced electronic packaging
                 manufacturing processing is primarily based on
                 materials and engineering sciences and includes almost
                 all of the basic disciplines of the materials
                 scientist. The papers in this volume include studies in
                 materials characterization, analytical chemistry,
                 polymer chemistry, electrochemical reactions, surface
                 phenomena, diffusion and permeation, mechanics, and
                 metallurgy. The authors emphasize the tradition of
                 close collaboration between the inventors and
                 implementers, and that the goal of this collaboration
                 was to establish a long-term set of improvements
                 through fundamental materials, process, and design
                 actions to allow continued incremental increases in
                 density and performance.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technology Div, Endicott, NY, USA",
  affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
  classification = "703; 713; 715",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuitization process sciences; electronics packaging
                 --- Processing; Materials; materials characterization;
                 mechanical modeling; moisture in polymers; printed
                 circuit board production; printed circuits",
}

@Article{Marsh:1984:MSD,
  author =       "Lyle L. Marsh and Ron Lasky and Donald P. Seraphim and
                 George S. Springer",
  title =        "Moisture Solubility and Diffusion in Epoxy and
                 Epoxy-Glass Composites",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "655--661",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The solubility and kinetics of moisture transport
                 mechanisms in epoxy-type resin and resin-glass
                 composites have been investigated over a range of
                 partial pressure and temperature. Moisture
                 absorption-desorption in these systems is a
                 quasi-reversible process, the kinetics of which are
                 non-Fickian (Type II) and dependent on prior history.
                 The multistaged sorption and transport behavior are
                 interpreted in terms of multiphase models.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technology Div, Endicott, NY, USA",
  affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
  classcodes =   "A6475 (Solubility, segregation, and mixing); A6630
                 (Diffusion in solids); A8160H (Surface treatment and
                 degradation of composites); B0550 (Composite materials
                 (engineering materials science)); B0560 (Polymers and
                 plastics (engineering materials science)); B2830C
                 (Organic insulation)",
  classification = "817; 944",
  corpsource =   "IBM Syst. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "composite materials; composites; dependent on;
                 diffusion in solids; environmental degradation; epoxy;
                 epoxy resins; epoxy-glass; epoxy-glass composites;
                 glass fibre; kinetics; mechanisms; moisture; moisture
                 --- Diffusion; moisture absorption-desorption; Moisture
                 Determination; moisture in polymers; moisture
                 solubility; moisture transport; moisture transport
                 mechanisms; multiphase models; multistaged sorption;
                 non-Fickian type II; organic insulating materials;
                 partial pressure; polymers; prior history; reinforced
                 plastics; solid solubility; solubility; temperature;
                 transport behavior; water absorption; water desorption;
                 water diffusion",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Berry:1984:BCM,
  author =       "Brian S. Berry and Walter C. Pritchet",
  title =        "Bending --- Cantilever Method for the Study of
                 Moisture Swelling in Polymers",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "662--667",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Self-induced bending of a bilayer strip is shown to be
                 a simple but sensitive method for the study of water
                 absorption and swelling in polymers. Expressions for
                 both the time-dependent and equilibrium curvature of
                 the strip have been derived, enabling both diffusional
                 and dilational parameters to be extracted from
                 experimental data. To illustrate the technique, it is
                 shown that a vacuum-dried epoxy swells linearly with
                 water content, at a rate of 0.93\% in volume per weight
                 percent of water. Desorption into vacuum has been
                 observed under diffusion-controlled conditions and the
                 diffusion coefficient for water in the epoxy found to
                 be 2.5 multiplied by 10** minus **9 cm**2/s at 295 K.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A6630J (Diffusion, migration, and
                 displacement of impurities in solids); A6845D
                 (Evaporation and condensation; interface adsorption and
                 desorption kinetics); A8170 (Materials testing); A8265M
                 (Sorption and accommodation coefficients (surface
                 chemistry)); B0560 (Polymers and plastics (engineering
                 materials science)); B0590 (Materials testing); B2830C
                 (Organic insulation)",
  classification = "801; 815; 944",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "absorption; adhesion; bending; bending cantilever
                 method; bending kinetics; bilayer strip; dependent
                 curvature; desorption; desorption in vacuum; diffusion
                 coefficient for; diffusion coefficient of water;
                 diffusion in solids; diffusion-controlled conditions;
                 diffusional parameters; dilatational parameters;
                 dilational parameters; environmental testing;
                 equilibrium curvature; experimental data; moisture;
                 moisture --- Diffusion; Moisture Determination;
                 moisture swelling; organic insulating materials;
                 polymer swelling; polymers; printed circuits ---
                 Materials; self induced; self-induced bending;
                 sorption; swelling; time; vacuum-dried epoxy; water;
                 water content",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Bindra:1984:MEMa,
  author =       "Perminder Bindra and David N. Light and David L.
                 Rath",
  title =        "Mechanisms of Electroless Metal Plating: {I}: Mixed
                 Potential Theory and the Interdependence of Partial
                 Reactions",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "668--678",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Electroless plating reactions are classified according
                 to four overall reaction schemes in which each partial
                 reaction is either under diffusion control or
                 electrochemical control. The theory of a technique,
                 based on the observation of the mixed potential as a
                 function of agitation, concentration of the reducing
                 agent, and concentration of metal ions, is presented.
                 By using this technique it is shown that in electroless
                 copper plating the copper deposition reaction is
                 diffusion-controlled, while the formaldehyde
                 decomposition reaction is activation-controlled. Values
                 of the kinetic and mechanistic parameters for the
                 partial reactions obtained by this method and by other
                 electrochemical methods indicate that the two partial
                 reactions are not independent of each other.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8160B (Surface treatment and degradation
                 of metals and alloys); A8245 (Electrochemistry and
                 electrophoresis)",
  classification = "539; 802",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "agitation; chemical reactions --- Reaction Kinetics;
                 copper; copper deposition; decomposition reaction;
                 diffusion control; electrochemical control;
                 electrochemistry; electroless Cu plating; electroless
                 deposition; electroless metal plating; electroless
                 plating; electroless plating reactions; formaldehyde;
                 formaldehyde oxidation; interdependence of partial
                 reactions; metal ions concentration; mixed potential
                 theory; reducing agent concentration; Theory",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Bindra:1984:MEMb,
  author =       "Perminder Bindra and Judith M. Roldan and Gary V.
                 Arbach",
  title =        "Mechanisms of Electroless Metal Plating: {II}:
                 Decomposition of Formaldehyde",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "679--689",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A detailed investigation of the decomposition of
                 formaldehyde was carried out to account for the fact
                 that formaldehyde decomposition on Group VIII metals,
                 e.g., Pd, occurs without simultaneous hydrogen
                 generation, while on Group IB metals, e.g., Cu,
                 formaldehyde decomposition is accompanied by hydrogen
                 evolution. It was found that in principle, metals may
                 be divided into three main classes: (1) metals with
                 positive free energy of hydrogen adsorption, (2) metals
                 with free energy of hydrogen adsorption close to zero,
                 and (3) metals with negative free energy of hydrogen
                 adsorption. In the case of class (1) metals
                 formaldehyde oxidation is accompanied by hydrogen
                 evolution; for class (2) metals there is no
                 simultaneous hydrogen evolution; and class (3) metals
                 show low 6n 51 catalytic activity for formaldehyde
                 oxidation. Hence, formaldehyde cannot be used as a
                 reducing agent for electroless plating of class (3)
                 metals.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8160B (Surface treatment and degradation
                 of metals and alloys); A8245 (Electrochemistry and
                 electrophoresis)",
  classification = "539; 802; 804",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "catalytic activity; chemical reactions ---
                 Decomposition; cyclic voltammetry curves;
                 electrochemistry; electroless deposition; electroless
                 metal plating; electroless plating; energy of H$_2$
                 adsorption; formaldehyde; formaldehyde --- Kinetic
                 Theory; formaldehyde decomposition; formaldehyde
                 oxidation; group IB metals; group viii metals; group
                 VIII metals; H$_2$ generation; hydrogen adsorption;
                 oxidation; reducing agent; Theory; volcano plots",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Horkans:1984:IEC,
  author =       "Jean Horkans and Carlos Sambucetti and Voya
                 Markovich",
  title =        "Initiation of Electroless {Cu} Plating on Nonmetallic
                 Surfaces",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "690--696",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Electroless plating of a metal on a dielectric
                 substrate requires the prior deposition of a catalyst
                 such as a Pd-Sn colloid consisting of a metallic Pd
                 core surrounded by a stabilizing layer of Sn ions. The
                 activation step (deposition of the colloid) is usually
                 followed by an acceleration step (removal of excess
                 ionic tin). Adhesion of the deposit to the substrate is
                 improved by mechanical and chemical pretreatment steps.
                 An electrochemical method has been developed for
                 assessing the catalytic activity of Pd-Sn colloids.
                 Hydrogen sorption in the Pd in the colloid can be
                 correlated with catalytic activity, since Pd accessible
                 for the H-sorption reaction is also accessible as the
                 catalyst for the electroless deposition reaction. These
                 conclusions have been confirmed by surface analytical
                 techniques and by functional tests. The efficacy of
                 various accelerating solutions has also been
                 assessed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8160B (Surface treatment and degradation
                 of metals and alloys); A8245 (Electrochemistry and
                 electrophoresis); B2210D (Printed circuit
                 manufacture)",
  classification = "539; 713; 801; 802; 942",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accelerating solutions; acceleration step; activation;
                 activation step; Catalysis; catalyst prior deposition;
                 catalytic activity assessment; chemical pretreatment
                 steps; chemical reactions --- Electrolytic; circuits;
                 colloid; copper; copper plating --- Applications; Cu
                 adhesion; cyclic-voltammetry; dielectric substrate;
                 electrochemistry; electroless Cu; electroless
                 deposition; electroless deposition reaction;
                 electroless plating; excess ionic Sn removal;
                 functional tests; layer of Sn ions; manufacture;
                 metallic Pd core; nonmetallic surfaces; PCB; Pd-Sn;
                 plating; plating initiation; printed; printed circuits
                 --- Manufacture; step; surface analytical; techniques;
                 voltmeters --- Applications",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Kim:1984:MED,
  author =       "Jungihl Kim and Sheree H. Wen and Dae Young Jung and
                 Robert W. Johnson",
  title =        "Microstructure Evolution During Electroless Copper
                 Deposition",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "697--710",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A study using transmission and scanning electron
                 microscopy was made of the evolution of the
                 microstructure of electroless plated Cu on activated
                 amorphous substrates and on single-crystal Cu grains.
                 On amorphous substrates activated in a
                 PdCl$_2$-SnCl$_2$ colloidal solution, Sn atoms
                 dissolved into the plating solution concurrently with
                 Cu deposition on the substrate during the initial stage
                 of deposition. The very small face-centered-cubic
                 grains of Cu-Pd solid solution agglomerated into much
                 larger particles and later coalesced into spherical
                 grains. As the grains grew, they developed
                 crystallographic facets, impinged upon one another, and
                 finally covered the entire substrate. Grains of
                 energetically favorable crystallographic orientation
                 selectively developed into the columnar structure.
                 These columnar grains contained subgrains,
                 dislocations, and twins. Remarkably different
                 structures were observed for the Cu grown on large
                 single-crystal grains.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A6170J (Etch pits, decoration, transmission
                 electron-microscopy and other direct observations of
                 dislocations); A6170N (Grain and twin boundaries);
                 A6480G (Microstructure); A6855 (Thin film growth,
                 structure, and epitaxy); A8115L (Deposition from liquid
                 phases (melts and solutions)); A8160B (Surface
                 treatment and degradation of metals and alloys); B2210D
                 (Printed circuit manufacture)",
  classification = "539; 933",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "activated amorphous substrates; columnar grains;
                 columnar structure; copper; copper plating; crystal
                 microstructure; crystallographic; crystals; Cu-Pd solid
                 solution; cubic grains; deposited coatings;
                 dislocations; electroless; electroless Cu plating;
                 electroless deposition; electroless plating; epitaxial
                 growth; face-centered-; growth rates; liquid phase;
                 low-surface-energy copper planes; microscope
                 examination of materials; microscopes, electron ---
                 Applications; Microstructure; microstructure evolution;
                 orientation; PdCl$_2$-SnCl$_2$ colloidal solution;
                 plating process; printed circuits; printed circuits ---
                 Manufacture; scanning electron; SEM; single crystal
                 copper grains; single-crystal Cu grains; subgrains;
                 substrate orientation; TEM; transmission electron;
                 transmission electron microscopy; twin boundaries;
                 twins",
  treatment =    "X Experimental",
}

@Article{Lee:1984:MMP,
  author =       "L. C. Lee and V. S. Darekar and C. K. Lim",
  title =        "Micromechanics of Multilayer Printed Circuit Boards",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "711--718",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Analytical and experimental techniques are reported
                 for the evaluation of micromechanical components in
                 multilayer printed circuit boards. The concern in this
                 investigation comes from the Z-axis thermal mismatch
                 between epoxy-glass and copper that generates stresses
                 when the board is subject to a temperature change.
                 Finite-element modeling for both plated through-holes
                 (PTH) and buried via (PV) structures is used to
                 calculate the stresses in the copper barrel and at the
                 via junctions. A simple experiment is designed to
                 measure the thermomechanical strain in the PTH barrel.
                 Also discussed are the PTH peel and PV pull techniques
                 which have been used to characterize the
                 barrel-laminate adhesion and the via junction
                 strength.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technology Div, Endicott, NY, USA",
  affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
  classcodes =   "B2210 (Printed circuits)",
  classification = "421; 703; 713",
  corpsource =   "IBM Syst. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "barrel-laminate adhesion; boards; buried via
                 structures; electronics packaging --- Thermal Effects;
                 epoxy-; epoxy-glass and copper; experimental
                 techniques; finite element analysis; finite element
                 modelling; finite-element modeling; glass copper
                 mismatch; junction strength; MLB; multilayer PCB;
                 multilayer printed circuit; multilayer printed circuit
                 board (MLB); plated through-holes; printed circuits;
                 programming via; PTH barrel; PTH peel; PV pull
                 techniques; stress distributions; Stresses; thermal
                 expansion; thermal expansion stresses; thermomechanical
                 strain; via; Z-axis thermal mismatch",
  treatment =    "X Experimental",
}

@Article{Kelly:1984:OIB,
  author =       "John H. Kelly and Chun K. Lim and William T. Chen",
  title =        "Optimization of Interconnections Between Packaging
                 Levels",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "719--725",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In large-scale integrated circuits, the interface
                 between ceramic modules and the next level ---
                 epoxy-glass circuit boards or cards --- contains a
                 large number of pin arrays. Because the modules and the
                 card are usually quite rigid and mechanically strong,
                 the interface between the module and the card is
                 commonly the weakest region in the assembly system.
                 This interface is where the differential deformations
                 between the two levels of packaging are accommodated.
                 This paper describes a theoretical and experimental
                 program to understand the loadings and stresses
                 present, and to optimize the design of the connecting
                 pin in order to distribute the stresses more evenly
                 across the surfaces of the braze joint that connects
                 the pin to the ceramic module.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM General Technology Div, Hopewell Junction, NY,
                 USA",
  affiliationaddress = "IBM General Technology Div, Hopewell Junction,
                 NY, USA",
  classcodes =   "B0170J (Product packaging); B2570 (Semiconductor
                 integrated circuits)",
  classification = "421; 713; 714",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "braze joint; braze joint stress analysis; ceramic
                 modules; connecting-pin design optimisation;
                 deformations; Design; differential; differential
                 deformations; electronics packaging --- Optimization;
                 epoxy-glass circuit boards; finite-element models;
                 integrated circuits; integrated circuits, LSI;
                 interconnections between packaging levels; interface
                 between ceramic modules; large scale integration;
                 large-scale; loadings; LSI; MLC modules; module PCB
                 interface; modules; multilayer ceramic modules;
                 packaging; pin arrays; printed circuits ---
                 Manufacture; stresses; stresses --- Thermal; VLSI",
  treatment =    "P Practical; X Experimental",
}

@Article{Kovac:1984:ITC,
  author =       "Zlata Kovac and King-Ning N. Tu",
  title =        "Immersion Tin: its Chemistry, Metallurgy, and
                 Application in Electronic Packaging Technology",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "726--734",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The surfaces in copper-plated through-holes in printed
                 circuit boards for complex electronic packaging can be
                 made solderable by immersion deposition of tin. The
                 properties of the prepared surfaces vary from those of
                 `white immersion tin,' which is easily wetted by molten
                 tin solder, to those of `gray immersion tin,' which is
                 nearly nonwettable. In this paper, the rate law for tin
                 deposition in the tin immersion plating bath is
                 studied. Certain effects of chemical composition of the
                 plating bath upon the character of the tin layer are
                 investigated and the effects of thermal annealing of
                 the plated surface upon the composition of the tin
                 layer are determined. The differences in composition of
                 white and gray immersion tin surface coatings are
                 revealed by X-ray diffraction Rutherford backscattering
                 spectroscopy and Auger electron spectroscopy.
                 Solderability tests on Sn, Cu, Cu$_3$Sn, and immersion
                 tin surfaces are included.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM Research Div, Yorktown Heights, NY, USA",
  classcodes =   "B0170G (General fabrication techniques); B0530 (Metals
                 and alloys (engineering materials science)); B0590
                 (Materials testing); B2210D (Printed circuit
                 manufacture)",
  classification = "539; 546; 713; 802",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Auger electron spectroscopy; backscattering
                 spectroscopy; chemical reactions --- Electrolytic;
                 chemistry; composition; copper plating; copper-plated
                 through-holes; Cu; Cu plated through holes; Cu/sub
                 3/Sn; deposition rate law; diffusion-controlled
                 kinetics; electronic packaging technology; gray
                 immersion tin; heat treatment --- Annealing; immersion
                 tin bath; immersion tin deposition; immersion tin
                 surfaces; materials testing; metallurgy; Plating;
                 printed circuit boards; printed circuits; printed
                 circuits --- Electronics Packaging; protective
                 coatings; PTH PCB; Sn; Sn ion deposition; Sn plating;
                 solderability test; solderability tests; soldering;
                 thermal annealing; tin; tin and alloys; tinning;
                 wettability; white immersion tin; X-ray diffraction
                 Rutherford",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Ginsburg:1984:HSP,
  author =       "Rochelle Ginsburg and John R. Susko",
  title =        "High-Temperature Stability of a Polyimide Film",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "735--740",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Polyimide (PMDA-ODA) films were analyzed by mass
                 spectroscopy to determine their high-temperature
                 stability. Using a high-resolution instrument, the
                 identity of the low-molecular-weight evolved gases was
                 confirmed. With a semiquantitative technique, the
                 effect of a vacuum pre-bake was shown to reduce
                 outgassing appreciably during subsequent treatment at
                 high temperature. Subjection of the films to moisture
                 did not affect their thermal stability. Low-temperature
                 processing (240 degree C vs 400 degree C) reduced
                 gaseous evolution by an order of magnitude.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technology Div, Endicott, NY, USA",
  affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
  classcodes =   "A6140K (Structure of polymers, elastomers, and
                 plastics); A8280M (Mass spectrometry (chemical
                 analysis)); B0560 (Polymers and plastics (engineering
                 materials science)); B2830C (Organic insulation)",
  classification = "703; 713; 801; 815",
  corpsource =   "IBM Syst. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electronics packaging --- High Temperature Effects;
                 Film; gaseous evolution; high-temperature stability;
                 low-; low-molecular-weight; low-temperature processing;
                 mass spectroscopy; moisture; molecular-weight evolved
                 gases; ODA; outgassing; PMDA-; polyimide film;
                 polyimides; polymer films; printed circuits ---
                 Manufacture; semiquantitative technique; spectroscopy
                 --- Applications; thermal stability; vacuum prebake
                 effects",
  treatment =    "X Experimental",
}

@Article{Schubert:1984:DGC,
  author =       "Steven A. Schubert",
  title =        "Determination of {Gafac} in Complex Solution
                 Matrices",
  journal =      j-IBM-JRD,
  volume =       "28",
  number =       "6",
  pages =        "741--747",
  month =        nov,
  year =         "1984",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This method utilizes a simple methylene chloride
                 extraction to separate the Gafac from interfering
                 chemical species, such as cupric sulfate. The
                 ultraviolet absorbance of the methylene chloride
                 extract is then measured at 276 nm and is shown to be
                 proportional to the concentration of Gafac over the
                 range of 1-170 ppm. However, this relationship is
                 nonlinear except for concentrations less than 15 ppm.
                 The limit of detection is 0.6 ppm and the relative
                 precision at the 10-ppm level is plus or minus 6\%.
                 Experiments to optimize and characterize various
                 aspects of the analytical procedure are described,
                 including determining the absorptivity of Gafac,
                 measuring the distribution ratio, calculating
                 extraction efficiencies, optimizing the extraction pH,
                 and evaluating selected spectral interferences.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technology Div, Endicott, NY, USA",
  affiliationaddress = "IBM Systems Technology Div, Endicott, NY, USA",
  classcodes =   "A8280D (Electromagnetic radiation spectrometry
                 (chemical analysis))",
  classification = "539; 801; 802; 803; 804; 921",
  corpsource =   "IBM Syst. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "170 ppm; absorptivity; agents; Analysis; analysis of
                 surfactants; analytic method; chemical analysis;
                 concentration range 1 to; Cu plating bath surface
                 active; distribution ratio; efficiencies; extract;
                 extraction; extraction --- Optimization; extraction pH
                 optimisation; Gafac; Gafac concentration measurement;
                 Gafac in complex solution matrices; methylene chloride;
                 methylene chloride extraction; multicomponent
                 solutions; multicomponent systems; Re-610; solutions
                 --- Electroplating; spectral interferences;
                 spectrochemical analysis; surface active agents;
                 ultraviolet absorbance; ultraviolet spectrophotometry;
                 UV spectrophotometry",
  treatment =    "P Practical; X Experimental",
}

@Article{Langlois:1985:DEG,
  author =       "W. E. Langlois",
  title =        "Dynamical Equations Governing a Lubricating Film
                 Consisting of a Gas Film Overlying a Liquid Film",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "2--10",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The dynamical equations governing a two-phase
                 lubricating configuration are derived. It is assumed
                 that a gas film overlines a liquid film, both thin
                 enough that the lubrication approximation may be used.
                 The analysis leads to coupled Reynolds equations
                 governing the pressure and the relative thickness of
                 the two films. The coupling, which is determined by
                 continuity of tangential stress across the gas-liquid
                 interface, is considerably simplified if the shear
                 viscosity of the liquid greatly exceeds that of the
                 gas.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Research Div, San Jose, CA, USA",
  affiliationaddress = "IBM, Research Div, San Jose, CA, USA",
  classcodes =   "A4715C (Laminar boundary layers); A4790 (Other topics
                 in fluid dynamics)",
  classification = "601; 607; 631; 921",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bearings --- Lubrication; continuity of tangential
                 stress; coupled Reynolds equations; coupling; dynamical
                 equations; gas bearings; gas film; gas film overlying;
                 gas-liquid; hydrodynamic lubrication; interface;
                 laminar flow; liquid film; lubricating film;
                 lubrication; lubrication approximation; mathematical
                 techniques; phase lubricating configuration; pressure;
                 Reynolds equations; shear flow; shear viscosity; Thin
                 Films; two-; viscosity",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chan:1985:SCS,
  author =       "Derek Y. C. Chan and Douglas Henderson and Jorge
                 Barojas and Andrew M. Homola",
  title =        "Stability of a Colloidal Suspension of Coated Magnetic
                 Particles in an Aqueous Solution",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "11--17",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Expressions for the magnetic, electrostatic and van
                 der Waals interactions between isolated magnetic
                 spheres which are coated with an inert material and
                 immersed in an aqueous electrolyte solution are
                 obtained and used to study the stability of a colloid
                 of spheres in an electrolyte. Use is made of a
                 simplified version of the theory of colloid stability
                 of Derjaguin, Landau, Verwey, and Overbeek. We find
                 that the colloidal dispersion becomes more stable as
                 (1) the electrolyte concentration is decreased, (2) the
                 radius of the magnetic spheres is decreased, or (3) the
                 thickness of the inert layer is increased. In order to
                 obtain stability with uncoated spheres, the spheres
                 should have radii of about 5 nm. Such radii are typical
                 of ferrofluids.",
  acknowledgement = ack-nhfb,
  affiliation =  "Australian Natl Univ, Canberra, Aust",
  affiliationaddress = "Australian Natl Univ, Canberra, Aust",
  classcodes =   "A7550M (Magnetic liquids); A8270D (Colloids); B3110
                 (Magnetic materials)",
  classification = "631; 701; 702; 801",
  corpsource =   "Dept. of Appl. Math., Australian Nat. Univ., Canberra,
                 ACT, Australia",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aqueous; aqueous electrolyte solution; coated magnetic
                 particles; coating thickness; colloid chemistry;
                 colloid of spheres; colloid stability; colloidal
                 dispersion; colloidal suspension; Derjaguin; Derjaguin
                 Landau Verwey Overbeeck theory; DLVO theory;
                 electrolyte concentration; electrolytes; electrostatic
                 interactions; ferrofluids; flow of fluids --- Spheres;
                 inert; interaction energy; isolated magnetic; Landau;
                 layer; magnetic fluids; magnetic interactions; magnetic
                 properties; Overbeek; solution; sphere size; spheres;
                 spherical radii; stability; uncoated spheres; van der
                 Waals interactions; Verwey",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Marsh:1985:DLI,
  author =       "L. L. Marsh and D. C. {Van Hart} and S. M.
                 Kotkiewicz",
  title =        "Dielectric Loss Investigation of Moisture in
                 Epoxy-Glass Composites",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "18--26",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Dielectric loss has been used to study moisture
                 absorption-desorption equilibria and kinetics in
                 epoxy-glass composites. Measurements were made at a
                 temperature of 90 degree C and a frequency of 200 Hz to
                 maximize sensitivity to interfacial or Maxwell-Wagner
                 polarization. Exposure to various partial pressures of
                 moisture at that temperature permitted a kinetics
                 analysis from which an estimate was made of the
                 diffusivity of water in the composites. Values of
                 dielectric loss at saturation were used to establish a
                 moisture\slash dielectric loss calibration at 90 degree
                 C which can be used to estimate the macroscopic
                 internal moisture content of coupon samples and printed
                 circuit cards and boards. Dielectric loss measurements
                 offer promise as a screening technique for resin-glass
                 coupler development.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Endicott, NY, USA",
  affiliationaddress = "IBM, Endicott, NY, USA",
  classcodes =   "B0550 (Composite materials (engineering materials
                 science)); B0590 (Materials testing); B2210 (Printed
                 circuits); B2830 (Insulation and insulating coatings);
                 B7310K (Dielectric variables measurement); B7320Z
                 (Other nonelectric variables measurement)",
  classification = "413; 701; 713; 817; 944",
  corpsource =   "Div. of Syst. Technol., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "absorption-desorption equilibria; analysis;
                 calibration; composite insulating materials; composite
                 materials; coupon; dielectric loss; dielectric loss
                 measurement; Dielectric Properties; diffusivity of
                 water; epoxy resins; epoxy-; glass; glass composites;
                 glass coupler development; humidity; interfacial
                 polarisation; interfacial polarization; kinetics;
                 macroscopic internal moisture content; materials
                 testing; Maxwell-Wagner polarization; moisture
                 diffusion measurement; moisture measurement;
                 moisture/dielectric loss; PCB; printed circuit boards;
                 printed circuit cards; printed circuits; printed
                 circuits --- Moisture Determination; resin-; samples;
                 screening technique",
  treatment =    "X Experimental",
}

@Article{Atkinson:1985:CDM,
  author =       "J. M. Atkinson and R. D. Granata and H. {Leidheiser,
                 Jr.} and D. G. McBride",
  title =        "Cathodic Delamination of Methyl Methacrylate-Based Dry
                 Film Polymers on Copper",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "27--36",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Studies of the bond degradation between a laminated
                 organic coating and a copper substrate have been
                 carried out using electrochemical techniques. The
                 failure of the bond is attributed to a cathodic
                 reaction which occurs under the coating. The rates of
                 delamination are shown to be affected by delay time
                 after exposure, temperature, applied potential,
                 composition of the electrolyte, and surface abrasion
                 prior to application of the coating.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Endicott, NY, USA",
  affiliationaddress = "IBM, Endicott, NY, USA",
  classcodes =   "B0560 (Polymers and plastics (engineering materials
                 science))B2210 (Printed circuits)",
  classification = "415; 539; 544; 804",
  corpsource =   "Div. of Syst. Technol., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abrasion; after exposure; applied potential; bond
                 degradation; bond failure; cathodic delamination;
                 cathodic reaction; coating; composite materials;
                 composition; copper; copper and alloys; copper
                 substrate; corrosion protection, cathodic; Cu
                 substrate; delamination; delay time; dry film polymers;
                 electrolyte; laminated organic; laminated products;
                 Manufacture; methyl methacrylate; methyl
                 methacrylate-based; organic compounds; PCB; polymer
                 films; printed circuits; surface; temperature",
  treatment =    "X Experimental",
}

@Article{Brown:1985:DAS,
  author =       "James A. Brown",
  title =        "A development of {APL2} syntax",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "37--48",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper develops the rules governing the writing of
                 APL2 expressions. The derivation of these rules is seen
                 as the orderly investigation of the usefulness of
                 written expressions as influenced by a few general
                 principles. Binding gives one concept that ties
                 together the concepts of order of execution, precedence
                 of operators over functions, use of parentheses, etc.
                 The principles can be phrased in terms of a few simple
                 rules that are easy to apply in practice, with the
                 general rule always ready to mediate any apparent
                 ambiguities. In addition to providing a simplified view
                 of APL 2 syntax, the principles give a framework under
                 which other extensions to APL2 can be considered.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, San Jose, CA, USA",
  affiliationaddress = "IBM, San Jose, CA, USA",
  classcodes =   "C6140D (High level languages)",
  classification = "723",
  corpsource =   "Div. of Gen. Products, IBM., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alp; alp 2; APL; APL2 expressions; APL2 syntax;
                 computer programming languages; computer systems
                 programming --- Input Output Programs; computers ---
                 Debugging; decisions; design; Design; development;
                 syntax",
  treatment =    "G General Review",
}

@Article{Takagi:1985:HSS,
  author =       "N. Takagi and C. K. Wong",
  title =        "A hardware sort-merge system",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "49--67",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A hardware sort-merge system which can sort large
                 files rapidly is proposed. It consists of an initial
                 sorter and a pipelined merger. In the initial sorter,
                 record sorting is divided into two parts: key-pointer
                 sorting and record rearranging. The pipelined merger is
                 composed of several intelligent disks each of which has
                 a simple processor and some buffers. The hardware sort
                 system can sort files of any size by using the
                 pipelined merger repeatedly. The key-pointer sorting
                 circuit in the initial sorter requires only
                 unidirectional connections between neighboring cells,
                 instead of the usual bidirectional ones. The initial
                 sorter can also generate sorted sequences longer than
                 its capacity so that the number of merging passes can
                 be reduced. A new data management scheme is proposed to
                 run all merging passes in a pipelined fashion.",
  acknowledgement = ack-nhfb,
  affiliation =  "Kyoto Univ, Jpn",
  affiliationaddress = "Kyoto Univ, Jpn",
  classcodes =   "C5220 (Computer architecture); C5440 (Multiprocessing
                 systems); C6130 (Data handling techniques)",
  classification = "722; 723",
  corpsource =   "Kyoto Univ., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; computer hardware; computer
                 systems programming --- Sorting; data; file
                 organisation; hardware sort-; intelligent disks; key-;
                 key-pointer sorting circuit; large files sorting;
                 management scheme; merge system; pipeline processing;
                 pipelined merger; pipelined sort-merger; pointer
                 sorting; record rearranging; record sorting; sort large
                 files rapidly; sorting; unidirectional connections",
  treatment =    "A Application; N New Development",
}

@Article{OMalley:1985:ACA,
  author =       "Lawrence V. O'Malley",
  title =        "Adaptive Clustering Algorithm",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "68--72",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Output data from many types of sensor systems (radar,
                 radar warning, sonar, electro-optical, etc.) must be
                 associated with one or more possible sources based on
                 multiple observations of the data. This paper presents
                 an algorithm that associates data with their source by
                 simultaneous n-dimensional clustering of multiple data
                 observations. The algorithm first orders the
                 observations by successive nearest neighbor, in the
                 n-dimensional Euclidean sense, from a defined starting
                 point. Clusters are then isolated using a method
                 derived from statistical decision theory. The
                 algorithm's primary feature is its ability to perform
                 clustering adaptively without any assumptions about the
                 size, number, or statistical characteristics of the
                 clusters. Since the algorithm was developed for radar
                 warning system processing, a performance comparison
                 with a well-known algorithm used in that field is
                 included.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Owego, NY, USA",
  affiliationaddress = "IBM, Owego, NY, USA",
  classcodes =   "B6140 (Signal processing and detection); B6320 (Radar
                 equipment, systems and applications); C7410F
                 (Communications computing)",
  classification = "716; 723",
  corpsource =   "Div. of Federal Syst., IBM., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adaptive clustering algorithm; alarm systems;
                 Algorithms; computer programming; computerised signal
                 processing; data clustering; data processing --- Data
                 Handling; dimensional clustering; electro-optical;
                 multiple data observations; multiple observations;
                 n-dimension clustering; ordered clusters; performance
                 comparison; pulse bearing angle; radar --- Computer
                 Applications; radar systems; radar warning system
                 processing; radar warning systems; simultaneous n-;
                 sonar; statistical decision theory; successive nearest
                 neighbor",
  treatment =    "A Application; G General Review; N New Development",
}

@Article{Mandeville:1985:NMA,
  author =       "Jon R. Mandeville",
  title =        "Novel Method for Analysis of Printed Circuit Images",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "73--86",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "To keep pace with the trend toward increased circuit
                 integration, printed circuit patterns are becoming
                 denser and more complex. A variety of automated visual
                 inspection methods to detect circuit defects during
                 manufacturing have been proposed. This paper describes
                 a method which is a synthesis of the
                 reference-comparison and the generic-property
                 approaches that exploits their respective strengths and
                 overcomes their respective weaknesses. It is based on
                 the observation that the local geometric and global
                 topological correctness of a printed circuit can be
                 inferred from the correctness of simplified, skeletal
                 versions of the circuit in a test image. These
                 operations can be realized using simple processing
                 elements which are well suited for implementation in
                 hardware.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B0170L (Inspection and quality control); B2210D
                 (Printed circuit manufacture); B6140C (Optical
                 information, image and video signal processing)",
  classification = "703; 713; 715; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automated methods; automated visual inspection
                 methods; automatic test equipment; computer aided
                 analysis; computerised picture processing; defects;
                 detect circuit; electronic circuits --- Testing;
                 electronic equipment testing; generic-;
                 generic-property method; inspection; manufacturing;
                 method; novel; PCB inspection; printed circuit image
                 analysis; printed circuits; processing elements;
                 property; reference-comparison; reference-comparison
                 method; skeletal versions; Testing; visual methods",
  treatment =    "A Application; N New Development",
}

@Article{Stapper:1985:EWW,
  author =       "C. H. Stapper",
  title =        "Effects of Wafer to Wafer Defect Density Variations on
                 Integrated Circuit Defect and Fault Distributions",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "1",
  pages =        "87--97",
  month =        jan,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Yield modelers have to take into account not only the
                 wafer to wafer variations in defect densities, but also
                 lot to lot, day to day, week to week, and month to
                 month variations in defect levels that occur in
                 integrated circuit fabrication. Models for these
                 effects are described in this paper. All these models
                 are based on the application of straightforward,
                 elementary statistics. They are developed from
                 fundamental random defect theory and adapted to actual
                 data by deductive analysis. The effects on defect and
                 fault distributions are derived; and a deficiency in
                 some previous yield models is eliminated.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Essex Junction, VT, USA",
  affiliationaddress = "IBM, Essex Junction, VT, USA",
  classcodes =   "B0240Z (Other topics in statistics); B2570
                 (Semiconductor integrated circuits)",
  classification = "713; 714; 922",
  corpsource =   "Div. of Gen. Technol., IBM., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "binomial model; defect distribution; density
                 variations; fault distributions; integrated circuit;
                 integrated circuit manufacture; LSI; manufacturing;
                 Monitoring; semiconductor device manufacture;
                 statistical analysis; statistical methods; technology;
                 VLSI; wafer partitioning; wafer to wafer defect; yield
                 models",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Stanley:1985:MB,
  author =       "Robert C. Stanley",
  title =        "Microprocessors in Brief",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "110--131",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a tutorial overview of the past,
                 present, and future of microprocessors and describes
                 the key elements of their structure and operation. It
                 is intended to serve as a technical introduction to the
                 rapidly expanding field of microprocessor and
                 microcomputer technology and to provide an overview of
                 what these elements are, what they can do, and how they
                 do it. The origin and evolution as well as the basic
                 principles of operation are discussed. Several
                 different types of microprocessor are considered and
                 examples of their application in the solution of
                 real-world problems are given. A comprehensive
                 bibliography covering the period from 1971 to 1984 is
                 included.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Process Automation Group, Boca Raton, FL, USA",
  affiliationaddress = "IBM, Process Automation Group, Boca Raton, FL,
                 USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips)",
  classification = "721; 722; 723",
  corpsource =   "IBM Syst. Products Div., Boca Raton, FL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Bibliographies; computers, microprocessor;
                 microcomputer; microprocessor chips; microprocessors;
                 real-world problems; technology; tutorial overview",
  treatment =    "G General Review",
}

@Article{Ungerboeck:1985:ADS,
  author =       "Gottfried Ungerboeck and Dietrich Maiwald and
                 Hans-Peter Kaeser and Pierre R. Chevillat and Jean Paul
                 Beraud",
  title =        "Architecture of a Digital Signal Processor",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "132--139",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A digital signal processor (DSP) is described which
                 achieves high processing efficiency by executing
                 concurrently four functions in every processor cycle:
                 instruction prefetching from a dedicated instruction
                 memory and generation of an effective operand, access
                 to a single-port data memory and transfer of a data
                 word over a common data bus, arithmetic\slash
                 logic-unit (ALU) operation, and multiplication.
                 Instructions have a single format and contain an
                 operand, index control bits, and two independent
                 operation codes called `transfer' code and `compute'
                 code. The first code specifies the transfer of a data
                 word over the common data bus, e.g., from data memory
                 to a local register. The second determines an operation
                 of the ALU on the contents of local registers. A fast
                 free-running multiplier operates in parallel with the
                 ALU and delivers a product in every cycle with a
                 pipeline delay of two cycles. The architecture allows
                 transversal-filter operations to be performed with one
                 multiplication and ALU operation in every cycle. This
                 is accomplished by a novel interleaving technique
                 called ZIP-ing. The efficiency of the processor is
                 demonstrated by programming examples.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Zurich Research Lab, Zurich, Switz",
  affiliationaddress = "IBM, Zurich Research Lab, Zurich, Switz",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220 (Computer architecture);
                 C5260 (Digital signal processing); C5440
                 (Multiprocessing systems)",
  classification = "716; 717; 718; 723",
  corpsource =   "IBM Res. Div., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arithmetic/logic-unit; common data bus; computer
                 architecture; computerised signal processing; cycle;
                 dedicated instruction; digital signal processor;
                 Digital Techniques; ing; instruction prefetching;
                 interleaving technique; memory; microprocessor chips;
                 multiplication; pipeline delay; pipeline processing;
                 processing efficiency; processor; signal processing;
                 single-port data memory; transversal-filter operations;
                 ZIP-",
  treatment =    "P Practical",
}

@Article{Beraud:1985:SPC,
  author =       "Jean Paul Beraud",
  title =        "Signal Processor Chip Implementation",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "140--146",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Very large microprocessors can now be integrated on a
                 single chip; the integration eliminates packaging
                 delays and is especially attractive for
                 performance-oriented processors such as signal
                 processors. This paper describes a semicustom signal
                 processor chip. The logic is implemented from an
                 optimized library of bipolar circuits. Layouts are
                 compatible and designed to map data flow structures
                 efficiently. Chip design time has been greatly reduced
                 through the use of developed CAD tools tailored to our
                 methodology. The design achieves twice the density that
                 would be possible (with the same technology) with a
                 masterslice. The chip's high performance has been
                 verified with hardware; it provides enough computation
                 power for 125 second-order filters with 8-kHz sampling
                 of the input signal.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM France, Essonnes Lab, Corbeil-Essonnes, Fr",
  affiliationaddress = "IBM France, Essonnes Lab, Corbeil-Essonnes, Fr",
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265F (Microprocessors and microcomputers); B2570B
                 (Bipolar integrated circuits); C5130 (Microprocessor
                 chips); C5260 (Digital signal processing); C7410D
                 (Electronic engineering computing)",
  classification = "713; 714; 716; 717; 718",
  corpsource =   "IBM France, Corbeil-Essonnes, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar circuits; bipolar integrated circuits; CAD;
                 chip implementation; circuit CAD; computation power;
                 computerised; data flow structures; Equipment;
                 integrated circuits; microprocessor chips;
                 microprocessors; performance-oriented processors;
                 processors; second-order filters; signal processing;
                 signals; tools",
  treatment =    "N New Development; P Practical",
}

@Article{Galand:1985:VPC,
  author =       "Claude Galand and Chantal Couturier and Guy Platel and
                 Robert Vermot-Gauchy",
  title =        "Voice-Excited Predictive Coder ({VEPC}) Implementation
                 on a High-Performance Signal Processor",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "147--157",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The authors discuss the implementation of a
                 medium-bit-rate linear prediction baseband coder on an
                 IBM bipolar signal processor prototype having a high
                 processing capacity. They show that the implementation
                 of our algorithm requires a processing load of 5 MIPS,
                 with a program size of 5K instructions. Then, the
                 application of our coder in a normal telephone
                 environment is discussed, which requires mu-law to
                 linear PCM conversion and other signal processing
                 functions such as voice activity detection, automatic
                 gain control, echo control, and error recovery. Quality
                 evaluation tests are reported which show that this type
                 of coder, operating at 7.2 kbps, allows the
                 transmission of telephone speech with communications
                 quality. Obtained intelligibility scores and speaker
                 recognition levels are high enough to demonstrate that
                 this coder is a good candidate for telephony
                 applications such as digital trunk transmissions,
                 satellite speech communications, secure voice
                 communications, and audio distribution systems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM France, La Gaude Lab, La Gaude, Fr",
  affiliationaddress = "IBM France, La Gaude Lab, La Gaude, Fr",
  classcodes =   "B1265F (Microprocessors and microcomputers); B6220
                 (Stations and subscriber equipment)",
  classification = "713; 714; 718; 723; 751; 752",
  corpsource =   "IBM France, La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic gain control; chips; computerised signal
                 processing; echo control; encoding; error recovery;
                 high-performance signal processor; IBM bipolar signal
                 processor; integrated circuits; intelligibility scores;
                 medium-bit-rate linear; microprocessor; PCM; prediction
                 baseband coder; pulse-code modulation; recognition
                 levels; signal processing --- Equipment; speaker;
                 speech --- Coding; telephone circuits; telephone
                 environment; telephone speech; vocoders; voice activity
                 detection; voice communication; voice-excited
                 predictive coder (VEPC)",
  treatment =    "A Application; N New Development; P Practical",
}

@Article{Shichman:1985:PIP,
  author =       "G. Shichman",
  title =        "{Personal Instrument (PI)} --- a {PC}-Based Signal
                 Processing System",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "158--169",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Personal Computer (PC) technology has seen an
                 enormous growth in the last two years. The PC is likely
                 to be limited for computation-intensive tasks such as
                 telecommunications and improved human-factors I/O. At
                 the same time, there has been another evolving
                 technology --- VLSI realization of general-purpose
                 signal processors (SP) which are capable of boosting
                 the performance levels of standard PCs by almost two
                 orders of magnitude. With SPs in PCs, we now see
                 tremendous opportunities for distributing
                 computation-intensive tasks away from high-performance
                 mainframe computers; previously formidable tasks such
                 as speech coding and recognition, pattern and scene
                 analysis, spectral analysis, high bit-rate
                 communication, and the like are now all computable by
                 utilizing a single VLSI module embedded in any standard
                 personal computer. A signal processing subsystem with
                 real-time data acquisition and control capabilities has
                 been developed for the IBM PC and is the topic of this
                 paper.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Speech
                 Recognition Group, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent, Speech
                 Recognition Group, Yorktown Heights, NY, USA",
  classcodes =   "B7210X (Other instrumentation and measurement
                 systems); B7220 (Signal processing and conditioning
                 equipment and techniques); C5260 (Digital signal
                 processing)",
  classification = "713; 714; 716; 717; 718; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "acquisition; advanced workstations; analysis;
                 computation-; Computer Applications; computerised
                 signal processing; general-purpose signal processor;
                 high bit-rate communication; integrated circuits, VLSI;
                 intensive tasks; module; modules; pattern analysis;
                 pc-based signal processing system; personal instrument
                 (pi); real-time coprocessor; real-time data; real-time
                 systems; scene analysis; signal processing; signal
                 processing equipment; spectral; speech coding; speech
                 recognition; superfast; system; VLSI",
  treatment =    "N New Development; P Practical",
}

@Article{Rayfield:1985:ADC,
  author =       "James T. Rayfield and Harvey F. Silverman",
  title =        "Approach to {DFT} Calculations Using Standard
                 Microprocessors",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "170--176",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of the DFT as an everyday tool is now
                 commonplace, principally due to advances in hardware
                 technology. Special-purpose VLSI chips for signal
                 processing are available. This paper describes an
                 approach which combines the Winograd Fourier Transform
                 Algorithms (WFTA) with a state-of-the-art 16-bit
                 general-purpose microprocessor for the purpose of DFT
                 calculation. The heart of the approach is the
                 real-input 240-point WFTA, which has been optimized for
                 time and space. An implementation for the 10-MHz M68000
                 executes in 10.8 ms. A simple hardware module is
                 described which implements the optimized software. The
                 use of the module for the inverse transform and for the
                 complex case is discussed. Advantages to the approach
                 taken are the low cost\slash performance ratio and the
                 general-purpose nature of the system that allows many
                 non-signal-processing functions to be performed by the
                 microprocessor.",
  acknowledgement = ack-nhfb,
  affiliation =  "Brown Univ, Lab for Engineering Man\slash Machine
                 Systems, Providence, RI, USA",
  affiliationaddress = "Brown Univ, Lab for Engineering Man/Machine
                 Systems, Providence, RI, USA",
  classcodes =   "B0290Z (Other numerical methods); B1265F
                 (Microprocessors and microcomputers); B7210X (Other
                 instrumentation and measurement systems); B7220 (Signal
                 processing and conditioning equipment and techniques);
                 C4190 (Other numerical methods); C5130 (Microprocessor
                 chips); C5260 (Digital signal processing)",
  classification = "713; 716; 717; 718; 723; 921",
  corpsource =   "Div. of Eng., Brown Univ. Providence, RI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computerised signal processing; cost/performance
                 ratio; DFT; DFT calculations; fast Fourier transforms;
                 Fourier Transform Algorithm; Fourier Transforms;
                 hardware module; integrated circuits; inverse;
                 mathematical transformations; microprocessor chips;
                 microprocessors; signal processing; signal processing
                 --- Computer Applications; standard microprocessors;
                 transform; VLSI; Winograd; Winograd Fourier transform
                 algorithm (WFTA)",
  treatment =    "N New Development; P Practical",
}

@Article{Abrams:1985:IPA,
  author =       "Michael J. Abrams and Annick Blusson and Veronique
                 Carrere and Phu Thien Nguyen and Yves Rabu",
  title =        "Image Processing Applications for Geologic Mapping",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "177--187",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of satellite data, particularly Landsat
                 images, for geologic mapping provides the geologist
                 with a powerful tool. The digital format of these data
                 permits applications of image processing to extract or
                 enhance information useful for mapping purposes.
                 Examples are presented of lithologic classification
                 using texture measures, automatic lineament detection
                 and structural analysis, and use of registered
                 multisource satellite data. In each case, the
                 additional mapping information provided relative to the
                 particular treatment is evaluated. The goal is to
                 provide the geologist with a range of processing
                 techniques adapted to specific mapping problems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM France, Paris, Fr",
  affiliationaddress = "IBM France, Paris, Fr",
  classcodes =   "A9165 (Geophysical aspects of geology and mineralogy);
                 A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research)",
  classification = "481; 723; 741",
  corpsource =   "IBM France, Paris, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automatic lineament detection; cartography;
                 computerised picture processing; digital; format;
                 geologic mapping; geological surveys; geology;
                 geophysical techniques; image processing; image
                 processing --- Enhancement; Imaging Techniques; Landsat
                 images; lithologic classification; mapping problems;
                 measures; remote sensing; satellite data; structural;
                 texture",
  treatment =    "X Experimental",
}

@Article{Todd:1985:PRC,
  author =       "Stephen Todd and Glen G. {Langdon, Jr.} and Jorma
                 Rissanen",
  title =        "Parameter Reduction and Context Selection for
                 Compression of Gray-Scale Images",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "188--193",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In the compression of multilevel (color or gray) image
                 data, effective compression is obtained economically by
                 judicial selection of the predictor and the
                 conditioning states or contexts which determine what
                 probability distribution to use for the prediction
                 error. The authors provide a cost-effective approach to
                 the following two problems: (1) to reduce the number of
                 coding parameters to describe a distribution when
                 several contexts are involved, and (2) to choose
                 contexts for which variations in prediction error
                 distributions are expected. They solve Problem 1
                 (distribution description) by a partition of the range
                 of values of the outcomes into equivalence classes,
                 called buckets. The result is a special decomposition
                 of the error range. Cost-effectiveness is achieved by
                 using the many contexts only to predict the bucket
                 (equivalence class) probabilities. They solve Problem 2
                 (economical contexts) by using the buckets of the
                 surrounding pixels as components of the conditioning
                 class. The bucket values have the desirable properties
                 needed for the error distributions.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, United Kingdom Scientific Cent, Winchester,
                 Engl",
  affiliationaddress = "IBM, United Kingdom Scientific Cent, Winchester,
                 Engl",
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723; 741",
  corpsource =   "IBM UK Sci. Centre, Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Analysis; buckets; classes; coding; compression;
                 conditioning class; context selection; data
                 compression; encoding; equivalence; error
                 distributions; gray-scale images; image processing;
                 parameter reduction; parameters; picture processing;
                 prediction error distributions",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Haas:1985:RSM,
  author =       "Peter J. Haas and Gerald S. Shedler",
  title =        "Regenerative Simulation Methods for Local Area
                 Computer Networks",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "2",
  pages =        "194--205",
  month =        mar,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68M10 (60K99 68U20 94A05)",
  MRnumber =     "86m:68006",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Local area computer network simulations are inherently
                 non-Markovian in that the underlying stochastic process
                 cannot be modeled as a Markov chain with countable
                 state space. The authors restrict attention to local
                 network simulations whose underlying stochastic process
                 can be represented as a generalized semi-Markov process
                 (GSMP). Using `new better than used' distributional
                 assumptions and sample path properties of the GSMP,
                 they provide a `geometric trials' criterion for
                 recurrence in this setting. They also provide
                 conditions which ensure that a GSMP is a regenerative
                 process and that the expected time between regeneration
                 points is finite. Steady-state estimation procedures
                 for ring and bus network simulations follow from these
                 results.",
  acknowledgement = ack-nhfb,
  affiliation =  "Stanford Univ, Dep of Operations Research, Stanford,
                 CA, USA",
  affiliationaddress = "Stanford Univ, Dep of Operations Research,
                 Stanford, CA, USA",
  classcodes =   "C5620L (Local area networks); C7430 (Computer
                 engineering)",
  classification = "716; 718; 723",
  corpsource =   "Dept. of Open Res., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bus network; computer networks; digital simulation;
                 evaluation; generalized semiMarkov process; local area;
                 local area computer networks; local area networks;
                 Local Networks; performance; points; properties;
                 recurrence; regeneration; regenerative process;
                 regenerative simulation; ring network; sample path;
                 stochastic process",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Knepper:1985:ABT,
  author =       "Ronald W. Knepper and Santosh P. Gaur and Fung-Yuel
                 Chang and G. R. Srinivasan",
  title =        "Advanced Bipolar Transistor Modeling: Process and
                 Device Simulation Tools for Today's Technology",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "218--228",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A series of programs has been developed and linked
                 together for doing advanced transistor modeling. The
                 strategy begins with a process modeling program,
                 SAFEPRO, for predicting two-dimensional impurity
                 profiles. These are input to a two-dimensional device
                 physics modeling program, 2DP, for generating device
                 electrical characteristics. A three-dimensional
                 distributed device model is then assembled by a model
                 generator program (MGP) which, in turn, is used to
                 derive a lumped equivalent-circuit model for numerical
                 circuit analysis. The tools make it possible to do
                 process sensitivity studies, perform process and device
                 optimization, and provide early feedback on technology
                 performance. The approach has recently been used to
                 examine and compare various technologies at IBM.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, General Technology Div, Exploratory Devices
                 Project, Hopewell Junction, NY, USA",
  affiliationaddress = "IBM, General Technology Div, Exploratory Devices
                 Project, Hopewell Junction, NY, USA",
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors)",
  classification = "714; 723; 921",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; bipolar transistor modeling; bipolar
                 transistors; device; device electrical characteristics;
                 device models; digital simulation; dimensional
                 distributed device model; electric networks ---
                 Equivalent Circuits; IBM; integrated circuits ---
                 Computer Simulation; lumped equivalent-circuit model;
                 Mathematical Models; mathematical techniques --- Finite
                 Element Method; model generator; model generator
                 program (MGP); numerical circuit; numerical circuit
                 analysis; process modeling program; process sensitivity
                 studies; process simulation; profiles; program;
                 SAFEPRO; semiconductor; semiconductor application of
                 finite elements to processing (SAFEPRO).; simulation
                 tools; three-; transistors, bipolar; two-dimensional
                 impurity",
  treatment =    "P Practical",
}

@Article{OBrien:1985:TPM,
  author =       "Redmond R. O'Brien and C. M. Hsieh and J. Scott Moore
                 and R. F. Lever and P. C. Murley and Karen W. Brannon
                 and G. R. Srinivasan and Ronald W. Knepper",
  title =        "Two-Dimensional Process Modeling: a Description of the
                 {SAFEPRO} Program",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "229--241",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the development, testing, and
                 application of a finite element program, the SAFEPRO
                 program (Semiconductor Applications of Finite Elements
                 to PROcessing), which simulates the processes used in
                 manufacturing transistors. The profiles calculated by
                 the program can be input directly into a device
                 analysis program. The paper includes a description of
                 the physical phenomena modeled and explains the choice
                 of the particular numerical methods used to solve the
                 resulting equations. It shows an example of the
                 application of the program to the design and
                 sensitivity study of a submicrometer shallow-junction
                 bipolar transistor and presents results obtained when
                 an oxide is grown on boron-doped silicon.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Computer Aided Device Design Dep, Hopewell
                 Junction, NY, USA",
  affiliationaddress = "IBM, Computer Aided Device Design Dep, Hopewell
                 Junction, NY, USA",
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors); C7410D
                 (Electronic engineering computing)",
  classification = "714; 921",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar transistors; device analysis program;
                 electronic engineering computing; element program;
                 finite; finite element analysis; mathematical models;
                 mathematical techniques --- Finite Element Method;
                 numerical methods; Processing; SAFEPRO program; SAFEPRO
                 program (semiconductor applications of finite elements
                 to); semiconductor device models; semiconductor
                 devices; submicrometer shallow-junction bipolar
                 transistor; transistors, bipolar --- Processing;
                 two-dimensional process modeling; two-dimensional
                 process modelling",
  treatment =    "P Practical",
}

@Article{Gaur:1985:TDS,
  author =       "Santosh P. Gaur and Peter A. Habitz and Young-June
                 Park and Robert K. Cook and Yi-Shiou Huang and Lawrence
                 F. Wagner",
  title =        "Two-Dimensional Device Simulation Program: {2Dp}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "242--251",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Mathematical details of a two-dimensional
                 semiconductor device simulation program are presented.
                 Applicability of the carrier transport model to shallow
                 junction bipolar transistors is discussed. Use of this
                 program to optimize device structures in new bipolar
                 technology is illustrated by presenting calculated
                 device characteristics for variations in a few selected
                 process conditions. Software links that automatically
                 transfer data from a two-dimensional process simulation
                 program and to a quasi-three-dimensional device
                 equivalent circuit model generation program are also
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Device Physics Technology Dep, Hopewell Junction,
                 NY, USA",
  affiliationaddress = "IBM, Device Physics Technology Dep, Hopewell
                 Junction, NY, USA",
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors); C7410D
                 (Electronic engineering computing)",
  classification = "714; 723",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bipolar technology; bipolar transistors; carrier
                 transport model; Computer Simulation; device models;
                 digital simulation; equivalent circuit model; process
                 conditions; quasi-three-dimensional device equivalent
                 circuit model; semiconductor; semiconductor devices;
                 shallow junction bipolar; shallow junction bipolar
                 transistors; transistors; transistors, bipolar ---
                 Mathematical Models; two-dimensional device simulation
                 program (2dp); two-dimensional semiconductor device
                 simulation program",
  treatment =    "P Practical",
}

@Article{Chang:1985:GTB,
  author =       "Fung-Yuel Chang and Lawrence F. Wagner",
  title =        "Generation of Three-Dimensional Bipolar Transistor
                 Models for Circuit Analysis",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "252--262",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The results of a two-dimensional bipolar numerical
                 device-analysis program are processed by identifying
                 three regions of the transistor: the intrinsic
                 transistor, the sidewall transistor, and the extrinsic
                 base collector diode. The key parameters which describe
                 each of these regions are extracted using a linking
                 program and fed into a quasi-three-dimensional device
                 analysis program referred to here as the Model
                 Generation Program (MGP). The MGP first generates a
                 large equivalent-circuit distributed network which
                 simulates the three-dimensional geometry of an actual
                 transistor. This distributed network is then analyzed
                 using the existing Advanced Statistical Analysis
                 Program (ASTAP) for circuit analysis. Finally the MGP
                 extracts parameters from the ASTAP analysis to
                 characterize the elements of a lumped-model equivalent
                 circuit, which is then suitable for the circuit design
                 of large-scale integrated circuit chips. The MGP is
                 sufficiently that transistors with a variety of
                 geometries can be generated without repeating the
                 two-dimensional analysis.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Bipolar Device Design \& Modeling Dep, Hopewell
                 Junction, NY, USA",
  affiliationaddress = "IBM, Bipolar Device Design \& Modeling Dep,
                 Hopewell Junction, NY, USA",
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2560B (Semiconductor device modelling and equivalent
                 circuits); B2560J (Bipolar transistors); B2570B
                 (Bipolar integrated circuits); C7410D (Electronic
                 engineering computing)",
  classification = "714; 723; 921",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "advanced statistical analysis program; advanced
                 statistical analysis program (ASTAP); analysis
                 computing; bipolar integrated circuits; bipolar
                 transistors; circuit; circuit analysis; Computer
                 Simulation; device-analysis program; dimensional
                 geometry; equivalent circuits; equivalent-circuit
                 distributed network; extrinsic base collector diode;
                 integrated circuits --- Computer Aided Analysis;
                 integration; intrinsic transistor; large scale; large-;
                 lumped-model equivalent circuit; model generation;
                 model generation program (MGP); numerical; program;
                 scale integrated circuit; semiconductor device models;
                 sidewall; three-; three-dimensional bipolar transistor
                 models; transistor; transistors, bipolar;
                 two-dimensional bipolar numerical device-analysis
                 program",
  treatment =    "P Practical",
}

@Article{Borucki:1985:FSF,
  author =       "Leonard Borucki and Howard H. Hansen and Khodadad
                 Varahramyan",
  title =        "{FEDSS} --- a {2D} Semiconductor Fabrication Process
                 Simulator",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "263--276",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The main features of the finite element semiconductor
                 process simulator Finite Element Diffusion Simulation
                 System (FEDSS) are described, with emphasis on a
                 recently added capability for generalized 2D oxidation
                 with impurity redistribution in oxide and silicon.
                 Examples are given that demonstrate the ability of the
                 program to oxidize various structures using a model
                 based on steady-state oxidant diffusion and
                 incompressible viscous oxide flow. Impurity profiles
                 and contours are also shown in both neutral and
                 oxidizing ambients, along with several comparisons with
                 data or with the program SUPREM II.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Advanced Mathematics \& Engineering Analysis Dep,
                 Essex Junction, VT, USA",
  affiliationaddress = "IBM, Advanced Mathematics \& Engineering
                 Analysis Dep, Essex Junction, VT, USA",
  classcodes =   "B2550 (Semiconductor device technology); B2570
                 (Semiconductor integrated circuits); C7410D (Electronic
                 engineering computing)",
  classification = "714; 723; 921",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2D oxidation with impurity redistribution in oxide and
                 silicon; Computer Simulation; digital simulation;
                 distribution; finite element analysis; finite element
                 diffusion simulation system (FEDSS); finite element
                 semiconductor process; impurity; impurity profiles;
                 impurity redistribution; incompressible viscous oxide
                 flow; integrated circuit technology; integrated
                 circuits; mathematical techniques --- Finite Element
                 Method; monolithic; oxidant diffusion; oxidation;
                 semiconductor device manufacture; simulator;
                 steady-state; steady-state oxidant diffusion",
  treatment =    "P Practical",
}

@Article{Cottrell:1985:VWC,
  author =       "Peter E. Cottrell and Edward M. Buturla",
  title =        "{VLSI} Wiring Capacitance",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "277--288",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Accurate prediction of device current and the
                 capacitance to be driven by that current is key to the
                 design of integrated logic and memory circuits. A
                 finite-element algorithm is described which simulates
                 the capacitance of structures with general shape in two
                 or three dimensions. Efficient solution of the linear
                 equations is provided by the incomplete Cholesky
                 conjugate gradient method. The model is used to
                 simulate the wiring capacitance of a 1.25-micrometer
                 VLSI technology. The predicted capacitances of closely
                 spaced first-metal polycide-gate and second-metal
                 conductors used in this technology agree with measured
                 results. The simulated three-dimensional capacitance of
                 a second-metal line crossing a first-metal line is
                 twice that found when estimated by two-dimensional
                 models. The effect of line-to-line capacitance on the
                 noise margin of logic circuits and on the signal in a
                 dynamic RAM is examined. This capacitance presents a
                 limit to wiring density for logic circuits and is a
                 significant signal detractor in dynamic RAMs with
                 closely spaced metal or diffused bit lines.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Advanced Design Dep, Essex Junction, VT, USA",
  affiliationaddress = "IBM, Advanced Design Dep, Essex Junction, VT,
                 USA",
  classcodes =   "B1265 (Digital electronics); B2570 (Semiconductor
                 integrated circuits)",
  classification = "713; 921; 942",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Armonk, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; capacitance; Cholesky conjugate gradient
                 method; closely spaced first-metal polycide-gate;
                 diffused bit lines; digital integrated circuits;
                 dynamic RAM; electric measurements --- Capacitance;
                 Electric Wiring; finite element; finite-element
                 algorithm; first-metal; incomplete Cholesky conjugate
                 gradient method; integrated circuits, VLSI;
                 line-to-line capacitance; logic circuits; logic
                 circuits --- Mathematical Models; mathematical
                 techniques --- Finite Element Method; polycide-gate;
                 second-metal conductors; three-dimensional; VLSI; VLSI
                 wiring capacitance; wiring density",
  treatment =    "P Practical",
}

@Article{Laux:1985:SDS,
  author =       "Steven E. Laux and Robert G. Byrnes",
  title =        "Semiconductor Device Simulation Using Generalized
                 Mobility Models",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "289--301",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method for discretizing the semiconductor transport
                 equations using generalized mobility models is
                 developed as an extension of the Scharfetter-Gummel
                 finite difference approach. The method is sufficiently
                 general to be applicable to nearly arbitrary empirical
                 mobility models (including those for MOS surface
                 effects) and may be used on a variety of mesh types in
                 two or three dimensions. The impact of generalized
                 mobility models on the sparsity of resulting discrete
                 equations is discussed. Convergence rate of a Newton's
                 method linearization of the nonlinear system of
                 equations is measured and interpreted. Some
                 computational results from a study of short-channel
                 MOSFETs are presented to illustrate the approach.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Yorktown Heights,
                 NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent, Yorktown
                 Heights, NY, USA",
  classcodes =   "B2560B (Semiconductor device modelling and equivalent
                 circuits); C7410D (Electronic engineering computing)",
  classification = "714; 723; 921",
  corpsource =   "Div. of Gen. Technol., IBM Corp., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "carrier mobility; Computer Simulation; convergence
                 rate; digital simulation; generalized mobility;
                 generalized mobility models; Gummel finite difference
                 approach; mathematical techniques --- Finite Difference
                 Method; mesh types; method linearization; models;
                 MOSFETs; Newton's; Newton's method linearization;
                 nonlinear system; Scharfetter-; Scharfetter-Gummel
                 finite difference approach; semiconductor device;
                 semiconductor device simulation; semiconductor devices;
                 semiconductor devices, MOS --- Mathematical Models;
                 semiconductor devices, MOSFET --- Transport Properties;
                 semiconductor transport equations; short-channel",
  treatment =    "P Practical",
}

@Article{Farrell:1985:ACD,
  author =       "Edward J. Farrell and Steven E. Laux and Phillip L.
                 Corson and Edward M. Buturla",
  title =        "Animation and {3D} Color Display of Multiple-Variable
                 Data: Application to Semiconductor Design",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "302--315",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The increasing complexity of digital simulations
                 requires more effective techniques to display and
                 interpret the voluminous outputs. Advanced digital
                 processing workstations and high-resolution color
                 monitors permit a wide range of new techniques for use
                 in examining the global characteristics of each output
                 variable and their interrelationships with other
                 variables. In this investigation, animation, 3D
                 display, and multiple-window imaging have been shown to
                 be effective in interpreting multiple-variable data
                 sets, both scalar and vector. These display methods are
                 used in the solution of two specific semiconductor
                 design problems: the avalanche breakdown of an n-MOSFET
                 and an alpha particle hit on an n-p-n transistor. With
                 these techniques the user can more fully utilize the
                 results of these long and costly computations, making
                 these methods a powerful addition to existing
                 techniques for imaging data.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
  classcodes =   "B2560 (Semiconductor devices); C7410D (Electronic
                 engineering computing)",
  classification = "723; 741",
  corpsource =   "Div. of Gen. Technol., IBM Corp., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3D color display; alpha particle hit; animation;
                 avalanche breakdown; CAD; characteristics; computer
                 graphics; digital; digital processing workstations;
                 display devices --- Monitoring; engineering
                 workstations; global; image processing; Imaging
                 Techniques; MOSFET; multiple-variable data;
                 multiple-window imaging; n-; npn transistor;
                 semiconductor design; semiconductor devices;
                 semiconductor devices --- Computer Aided Design;
                 semiconductor devices, MOSFET --- Design; simulations;
                 transistors --- Design",
  treatment =    "P Practical",
}

@Article{Bouchard:1985:ECH,
  author =       "Gilles Bouchard and David B. Bogy and Frank E. Talke",
  title =        "Experimental Comparison of the Head\slash Disk
                 Interface Dynamics in 5.25- and 8-inch Disk Drives",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "3",
  pages =        "316--323",
  month =        may,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A laser Doppler vibrometer is used to measure the
                 head\slash disk interface dynamics in computer disk
                 drives. The stability of the head under steady
                 operating conditions is compared between a 5 one
                 quarter -inch and two different 8-inch Winchester
                 drives. In the larger drives, high-frequency vibrations
                 (between 5 and 10 kHz) are detected on the slider which
                 are not present in the smaller drive. These vibrations
                 have amplitudes on the order of magnitude of the
                 head\slash disk spacing and are related to the rolling
                 and pitching modes of the slider. The vibrations of the
                 disk, suspension, and actuator arm are also
                 investigated and correlated with the results obtained
                 on the slider.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Device Mechanics Dep, San Jose, CA, USA",
  affiliationaddress = "IBM, Device Mechanics Dep, San Jose, CA, USA",
  classcodes =   "B3120B (Magnetic recording); B7320C (Spatial variables
                 measurement); C5320C (Storage on moving magnetic
                 media)",
  classification = "722",
  corpsource =   "Div. of Res., IBM Corp., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "5 1/4 inch disk drives; 8-inch disk drives; actuator
                 arm; data storage, magnetic; Disk; Doppler effect ---
                 Laser Applications; Doppler vibrometer; electric drive
                 --- Vibrations; head/disk interface dynamics; laser;
                 magnetic disc storage; measurement; measurement by
                 laser beam; pitching modes; rolling and pitching modes
                 of slider; rolling modes; stability; suspension;
                 vibration; Winchester drives",
  treatment =    "X Experimental",
}

@Article{Chow:1985:AMS,
  author =       "We-Min Chow and Edward A. MacNair and Charles H.
                 Sauer",
  title =        "Analysis of manufacturing systems by the {Research
                 Queueing Package}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "330--342",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Many aspects of manufacturing systems can be analyzed
                 using simulation to model the system's behavior. The
                 Research Queueing Package (RESQ) is a tool developed to
                 construct and solve models of systems with jobs
                 contending for service from many resources. The
                 capabilities of RESQ are described in order to
                 understand the model elements which are available for
                 representing manufacturing systems. Then an analysis of
                 several work-in-process (WIP) policies is presented
                 using RESQ models solved by simulation. Four WIP
                 management policies are analyzed and compared for a
                 future assembly manufacturing line: (1) a push system,
                 (2) a pull system, (3) a transfer line, and (4) a
                 closed loop system.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Advanced Manufacturing Engineering Group, San
                 Jose, CA, USA",
  affiliationaddress = "IBM, Advanced Manufacturing Engineering Group,
                 San Jose, CA, USA",
  classcodes =   "C6115 (Programming support); C7490 (Computing in other
                 engineering fields)",
  classification = "723; 912; 922",
  corpsource =   "Div. of Gen. Products, IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "closed loop system; computer aided analysis; computer
                 aided manufacturing; Computer Simulation; computer
                 software; digital simulation; management;
                 manufacturing; manufacturing industries; manufacturing
                 systems; probability --- Queueing Theory; processes;
                 pull system; push; research queueing package; Research
                 Queueing Package; RESQ; software tools; system; systems
                 science and cybernetics; transfer line",
  subject =      "D.4.8 Software, OPERATING SYSTEMS, Performance,
                 Queueing theory \\ J.1 Computer Applications,
                 ADMINISTRATIVE DATA PROCESSING, Manufacturing \\ I.6.3
                 Computing Methodologies, SIMULATION AND MODELING,
                 Applications \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS, Modeling techniques \\ F.2.2
                 Theory of Computation, ANALYSIS OF ALGORITHMS AND
                 PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Routing and layout",
  treatment =    "A Application",
}

@Article{Engelke:1985:IMM,
  author =       "Helmut Engelke and Jens Grotrian and Claus Scheuing
                 and Arno Schmackpfeffer and Walter Schwarz and Bernhard
                 Solf and Josef Tomann",
  title =        "{Integrated Manufacturing Modeling System}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "343--355",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The objective of the Integrated Manufacturing Modeling
                 System (IMMS) project was to build a generic software
                 package for manufacturing modeling. The package allows
                 interactive model building, testing, and
                 experimentation. IMMS integrates the fundamental
                 components of modeling, namely system description, data
                 acquisition and management, graphic input and output,
                 and performance simulation. The fundamental idea is to
                 describe the flow of information, materials, and
                 resources by using parametric standard model building
                 blocks. Inputting is done by placing function symbols
                 on a graphic screen and by filling in blanks for
                 parameter data. The output includes all common
                 performance measures, such as utilization and work in
                 process (WIP), in graphic form. The simulation language
                 used to implement the model building blocks is RESQ2.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Germany, German Manufacturing Technology Cent,
                 Manufacturing Line Architecture Dep, Sindelfingen, West
                 Ger",
  affiliationaddress = "IBM Germany, German Manufacturing Technology
                 Cent, Manufacturing Line Architecture Dep,
                 Sindelfingen, West Ger",
  classcodes =   "C6115 (Programming support); C7490 (Computing in other
                 engineering fields)",
  classification = "723",
  corpsource =   "German Manuf. Technol. Center, IBM Germany,
                 Sindelfingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided manufacturing; computer simulation;
                 computer software; design; digital simulation; generic
                 software package; IMMS; integrated manufacturing
                 modeling system; interactive model; manufacturing;
                 manufacturing industries; modeling; RESQ2; simulation
                 language; software tools",
  review =       "ACM CR 8608-0754",
  subject =      "I.6.3 Computing Methodologies, SIMULATION AND
                 MODELING, Applications \\ J.6 Computer Applications,
                 COMPUTER-AIDED ENGINEERING \\ J.1 Computer
                 Applications, ADMINISTRATIVE DATA PROCESSING,
                 Manufacturing",
  treatment =    "A Application",
}

@Article{Haines:1985:ACR,
  author =       "Calvin L. Haines",
  title =        "Algorithm for Carrier Routing in a Flexible
                 Material-Handling System",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "356--362",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Flexible material-handling systems for manufacturing
                 have the capability of moving articles or carriers
                 between process stations in different sequences. The
                 traditional method for controlling the routing of
                 carriers is to determine, in advance, all of the useful
                 paths within the system, and store the information in a
                 central computer until needed. This article describes a
                 routing algorithm that determines the correct turns a
                 carrier should make while it is in motion. Making
                 routing decisions does not require a global knowledge
                 of the system's layout, because a method of numbering
                 stations within the system which reflects its natural
                 path of flow is employed. A brief survey of
                 contemporary material-handling mechanisms is provided.
                 The implementation of the algorithm using distributed
                 controllers is discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, General Products Div, Tucson, AZ, USA",
  affiliationaddress = "IBM, General Products Div, Tucson, AZ, USA",
  classcodes =   "C3320 (Control applications to materials handling);
                 C3355 (Control applications in manufacturing
                 processes); C7420 (Control engineering computing)",
  classification = "691; 723",
  corpsource =   "Div. of Gen. Products, IBM, Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "carrier routing; Computer Applications; computer
                 programming --- Algorithms; computerised materials
                 handling; distributed control; distributed controllers;
                 flexible manufacturing systems; flexible
                 material-handling system; manufacturing; materials
                 handling; routing algorithm",
  treatment =    "A Application; P Practical",
}

@Article{Taylor:1985:PME,
  author =       "Russell H. Taylor and Ralph L. Hollis and Mark A.
                 Lavin",
  title =        "Precise Manipulation with Endpoint Sensing",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "363--376",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes recent work on manipulation
                 strategies that rely on `coarse-fine' robot hardware
                 and direct sensing of part-workpiece relationships. The
                 experiments reported use an extremely precise,
                 high-bandwidth planar `wrist' and an industrial vision
                 system to perform accurate alignment of small parts.
                 The system architecture, experimental hardware, and
                 programming methods employed are all discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Robot Systems Technology Project, Yorktown
                 Heights, NY, USA",
  affiliationaddress = "IBM, Robot Systems Technology Project, Yorktown
                 Heights, NY, USA",
  classcodes =   "C3120C (Spatial variables control); C3320 (Control
                 applications to materials handling); C3355 (Control
                 applications in manufacturing processes); C7420
                 (Control engineering computing)",
  classification = "691; 731",
  corpsource =   "Div. of Res., IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "alignment; architecture; coarse fine robot hardware;
                 computer vision; endpoint sensing; hardware; high
                 bandwidth planar wrist; industrial robots; industrial
                 vision system; manipulation; Manipulators; materials
                 handling; position control; precise manipulation;
                 programming; robotics",
  treatment =    "P Practical; X Experimental",
}

@Article{Yashchin:1985:ADC,
  author =       "Emmanuel Yashchin",
  title =        "On the Analysis and Design of {Cusum-Shewhart} Control
                 Schemes",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "377--391",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a new approach to design of
                 CUSUM-Shewhart control schemes and analysis of the
                 associated run length distributions (under the
                 assumption that the observations correspond to a
                 sequence of independent and identically distributed
                 random variables). This approach is based on the theory
                 of Markov chains and it enables one to analyze the ARL
                 (Average Run Length), the distribution function of the
                 run length, and other quantities associated with a
                 CUSUM-Shewhart scheme. In addition, it enables one to
                 analyze situations in which out-of-target conditions
                 are not present initially, but rather appear after a
                 substantial period of time during which the process has
                 operated in on-target mode (steady state analysis). The
                 paper also introduces an APL package, DARCS, for
                 design, analysis, and running of both one-and two-sided
                 CUSUM-Shewhart control schemes and gives several
                 examples of its application.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
  classcodes =   "C1310 (Control system analysis and synthesis
                 methods)",
  classification = "723; 913",
  corpsource =   "Div. of Res., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL package; average run length; computer software;
                 control system analysis; control system synthesis;
                 cumulative sum control charts; CUSUM; Cusum-Shewhart
                 control schemes; DARCS; DARCS software package;
                 distribution function; Markov chains; quality control;
                 run length distributions; sequential hypothesis
                 testing; Shewhart control schemes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gershwin:1985:SPS,
  author =       "Stanely B. Gershwin and Ramakrishna Akella and Yong F.
                 Choong",
  title =        "Short-Term Production Scheduling of an Automated
                 Manufacturing Facility",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "392--400",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The authors describe a new implementation of the
                 Kimemia-Gershwin hierarchical policy for the real-time
                 scheduling of flexible manufacturing systems. Major
                 improvements result at all three levels of the policy.
                 The algorithm simplification, resulting in substantial
                 reductions of off-line and on-line computation time, is
                 reported, as is the improvement in performance through
                 the elimination of chattering. Simulation results based
                 on a detailed model of a printed circuit card assembly
                 facility are summarized.",
  acknowledgement = ack-nhfb,
  affiliation =  "MIT, Lab for Information \& Decision Systems,
                 Cambridge, MA, USA",
  affiliationaddress = "MIT, Lab for Information \& Decision Systems,
                 Cambridge, MA, USA",
  classcodes =   "B2210D (Printed circuit manufacture); C1290F (Systems
                 theory applications in industry); C1340B (Multivariable
                 control systems); C3350Z (Control applications in other
                 industries); C3355 (Control applications in
                 manufacturing processes); C7420 (Control engineering
                 computing)",
  classification = "723; 913",
  corpsource =   "Lab. for Inf. and Decision Syst., MIT, Cambridge, MA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; automated manufacturing facility;
                 chattering; circuit card assembly; computer aided
                 manufacturing; flexible; flexible manufacturing
                 systems; hierarchical policy; hierarchical systems;
                 Kimemia-Gershwin; manufacturing systems; printed;
                 printed circuit manufacture; production control;
                 production scheduling; real-time scheduling;
                 scheduling; short-term production scheduling",
  treatment =    "P Practical",
}

@Article{Wittrock:1985:SAF,
  author =       "Robert J. Wittrock",
  title =        "Scheduling Algorithms for Flexible Flow Lines",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "401--412",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses scheduling algorithms for a
                 certain kind of manufacturing environment, called the
                 `flexible flow line'. Two scheduling problems are
                 considered. `Loading' decides when each part should be
                 loaded into the system. `Mix allocation' selects the
                 daily part mix. The goals are to maximize throughput
                 and reduce WIP. New heuristic algorithms specially
                 suited to solve these problems in the context of a
                 flexible flow line are described. The paper also
                 discusses experience with the use of an experimental
                 implementation of these algorithms to solve such
                 problems arising in a real production line.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Manufacturing
                 Logistics Group, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent,
                 Manufacturing Logistics Group, Yorktown Heights, NY,
                 USA",
  classcodes =   "C1290F (Systems theory applications in industry);
                 C3350 (Control in industrial production systems); C3355
                 (Control applications in manufacturing processes)",
  classification = "723; 913",
  corpsource =   "Thomas J. Watson Res. Center, IBM, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer aided manufacturing; computer programming ---
                 Algorithms; flexible flow; flexible flow lines;
                 flexible manufacturing system; flexible manufacturing
                 systems; heuristic algorithms; heuristic programming;
                 lines; mix allocation; production control; scheduling;
                 scheduling algorithms",
  treatment =    "A Application; X Experimental",
}

@Article{Fellenstein:1985:PMK,
  author =       "Craig Fellenstein and Charles O. Green and Lucinda M.
                 Palmer and Adrian Walker and David J. Wyler",
  title =        "A prototype manufacturing knowledge base in {Syllog}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "413--421",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a prototype knowledge base for
                 manufacturing planning, which the authors have built
                 using a knowledge system shell called Syllog. They
                 describe a Tester Capacity Planning and Yield Analysis
                 task, knowledge needed for a part of the task, and the
                 use of the knowledge in the Syllog system. They report
                 that the sometimes difficult process of knowledge
                 acquisition turned out, in this case, to be
                 straightforward. Knowledge acquisition and knowledge
                 use are done in the same language in Syllog.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, General Products Div, Tucson, AZ, USA",
  affiliationaddress = "IBM, General Products Div, Tucson, AZ, USA",
  classcodes =   "B0170E (Production facilities and engineering); B7210B
                 (Automatic test and measurement systems); C7160
                 (Manufacturing and industrial administration); C7410D
                 (Electronic engineering computing)",
  classification = "723",
  corpsource =   "Div. of Gen. Products, IBM, Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "base; computer aided manufacturing; computer software;
                 electronic engineering computing; electronic equipment;
                 electronic equipment testing; expert systems;
                 manufacture; manufacturing data processing;
                 manufacturing planning; production testing; prototype
                 manufacturing knowledge; prototype manufacturing
                 knowledge base; Syllog; testing",
  treatment =    "A Application; P Practical",
}

@Article{Corongiu:1985:LSA,
  author =       "Giorgina Corongiu and John H. Detrich",
  title =        "Large-Scale Scientific Application Programs in
                 Chemistry and Physics on an Experimental Parallel
                 Computer System",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "4",
  pages =        "422--432",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The authors present and discuss an experimental
                 distributed system consisting of two IBM 4341s, and IBM
                 4381, and ten FPS-164 attached processors, configured
                 to allow parallel execution of a single large-scale
                 calculation on multiple processors. A number of their
                 application programs have been converted to run on this
                 system, and the strategy for this conversion is
                 outlined in sufficient detail to facilitate the
                 development of tests using other scientific and
                 engineering computer application programs. Their tests,
                 though limited to certain biochemical and
                 physicochemical problems, demonstrate the versatility,
                 flexibility, and accessibility of this system.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Data Systems Div, Kingston, NY, USA",
  affiliationaddress = "IBM, Data Systems Div, Kingston, NY, USA",
  classcodes =   "C5440 (Multiprocessing systems); C5470 (Performance
                 evaluation and testing); C7320 (Physics and chemistry
                 computing)",
  classification = "722; 723",
  corpsource =   "Div. of Data Syst., IBM, Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "biochemical; calculation; chemistry; chemistry
                 computing; computer programming; computer systems,
                 digital; computer testing; computing; data processing
                 --- Natural Sciences Applications; distributed
                 computing; distributed system; experimental parallel
                 computer system; FPS-164; IBM 4381; large-scale;
                 large-scale scientific application programs;
                 large-scale systems; multiple processors; Parallel
                 Processing; parallel processing; performance
                 evaluation; physicochemical; physics",
  treatment =    "A Application; P Practical",
}

@Article{Williams:1985:DIS,
  author =       "Thomas H. Williams",
  title =        "Design and Implementation of the {Selectric
                 System\slash 2000}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "443--448",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents an overview of the papers in this
                 issue covering the design and implementation of the
                 SELECTRIC System\slash 2000 Typewriter\slash Printer
                 products. The SELECTRIC System\slash 2000 products
                 comprise a nonimpact typewriter and printer, two impact
                 typewriters, and an impact printer which use printwheel
                 technology. The development approach for the SELECTRIC
                 System\slash 2000 products, which included design for
                 automation, introduction of new technologies, and
                 product development concurrent with manufacturing, was
                 accomplished by the use of common architecture,
                 hardware, and software.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "C5540 (Terminals and graphic displays); C5550
                 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "common architecture; computer peripheral equipment ---
                 Printers; Design; impact printer; impact typewriters;
                 nonimpact; nonimpact printers; nonimpact typewriter and
                 printer; printers; printing --- Equipment; printwheel;
                 printwheel technology; product development; selectric
                 system/2000; SELECTRIC System/2000; technology;
                 typewriter; typewriters",
  treatment =    "P Practical",
}

@Article{Pennington:1985:RRT,
  author =       "Keith S. Pennington and Walter Crooks",
  title =        "Resistive Ribbon Thermal Transfer Printing: a
                 Historical Review and Introduction to a New Printing
                 Technology",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "449--458",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a new high-quality thermal
                 transfer printing process in which a printhead
                 consisting of a linear array of small-diameter
                 electrodes produces highly localized Joule heating of a
                 resistive thermal transfer printing ribbon. The heat
                 generated in the resistive ribbon results in the
                 melting of a thermoplastic ink which is then
                 transferred to a printable medium, such as paper, by
                 contact. The origins of the technology are discussed,
                 together with a description of the resistive ribbon
                 materials and structure, the printhead, and some
                 experimental printer performance values.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Image
                 Technologies Dep, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent, Image
                 Technologies Dep, Yorktown Heights, NY, USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "723; 745",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Computer Applications; computer peripheral equipment
                 --- Printers; high-quality thermal transfer printing;
                 highly; ink; linear array; localized Joule heating;
                 printer performance values; printhead; printing;
                 printing technology; resistive ribbon; small-diameter
                 electrodes; thermal printers; thermal transfer
                 printing; thermoplastic; thermoplastic ink",
  treatment =    "N New Development; P Practical",
}

@Article{Applegate:1985:IRR,
  author =       "Steven L. Applegate and John C. Bartlett and Alan E.
                 Bohnhoff and Alan S. Campbell and James J. Molloy",
  title =        "Implementation of the Resistive Ribbon Technology in a
                 Printer and Correcting Typewriter",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "459--469",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes key technology implementation
                 details and performance characteristics of a printer
                 and typewriter using the resistive ribbon technology.
                 The work describes the commercial application of this
                 print and correction technology. Key parameters
                 necessary for proper system function such as current,
                 various forces, velocities, and component integration
                 are discussed. The rationales behind various
                 compromises and problem solutions are given. A
                 discussion of the characteristics of the print
                 produced, along with application strengths and
                 weaknesses, completes the paper.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "component integration; computer peripheral equipment;
                 correcting typewriter; printer; Printers; printing ---
                 Equipment; resistive ribbon; resistive ribbon
                 technology; system function; thermal printers;
                 typewriters",
  treatment =    "P Practical",
}

@Article{Twardeck:1985:CRR,
  author =       "Thomas G. Twardeck",
  title =        "Characterization of a Resistive Ribbon Thermal
                 Transfer Printing Process",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "470--477",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Resistive ribbon thermal transfer printers transfer
                 ink from a ribbon to paper as the result of localized
                 Joule heating of the ribbon structure. For this
                 printing process, this paper discusses the
                 voltage-versus-current response of the electrode-ribbon
                 current path, the temperature distributions throughout
                 the ribbon structure, and the correlation of print
                 response with electrical input power and average ribbon
                 temperatures. Nominal input power per electrode is
                 approximately 190 mw. For input power near this level,
                 thermal models predict that ribbon materials which pass
                 directly under energized electrodes reach the highest
                 temperatures; the hottest zone in the ribbon surrounds
                 the composite-aluminum interface. Approximately 0.1 mm
                 downstream from the electrodes, the heated ribbon
                 materials come to nearly constant temperature. The area
                 of the printed image correlates with this average
                 ribbon temperature and input power.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745; 804",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; electrode-ribbon
                 current path; heated ribbon materials; ink --- Heating;
                 input power; joule heating; localized Joule heating;
                 print response; Printers; printing --- Heating;
                 resistive ribbon; ribbon temperatures; temperature
                 distribution; temperature distributions; thermal
                 models; thermal printers; thermal transfer printing;
                 thermal transfer printing process;
                 voltage-versus-current response",
  treatment =    "P Practical; X Experimental",
}

@Article{DeFosse:1985:DMS,
  author =       "Stephen F. DeFosse and George T. Williams and Dominic
                 A. {Gostomski, Jr.} and Robert H. Cobb",
  title =        "Development of a Membrane Switch-Type Full-Travel
                 Tactile Keyboard",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "478--487",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes the approaches to design and the
                 rationale that satisfied the requirements for a
                 full-travel keyboard with usage exceeding 10 million
                 actuations per character, satisfactory N-key roll-over,
                 and phantom key control. Emphasis was on understanding
                 the effects of all material and design decisions.
                 Interactions among design, material, and processing
                 variables were revealed through statistical parameter
                 modeling and environmental exposure studies. This
                 knowledge facilitated the control of critical
                 parameters to permit an order-of-magnitude reduction of
                 actuation forces and tolerances. Product reliability
                 was achieved through evaluation, environmental
                 protection features, and stringent process controls.
                 This paper highlights the design, materials, and
                 processing of the membrane switch developed for
                 low-force keyboard applications.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "B2180B (Relays and switches); C5500 (Computer
                 peripheral equipment)",
  classification = "631; 722; 745",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "actuation forces; computer peripheral equipment ---
                 Printers; environmental exposure; full-travel tactile
                 keyboard; Keyboards; keyboards; low-force keyboard;
                 membrane switch-type full-travel tactile keyboard;
                 membranes --- Switching; modeling; N-key; phantom key
                 control; process controls; reliability; roll-over;
                 statistical parameter; switches; typewriters",
  treatment =    "N New Development; P Practical",
}

@Article{Mayo:1985:SCP,
  author =       "Randy D. Mayo",
  title =        "System Control for a Printwheel Typewriter",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "488--493",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents the design goals and architecture
                 of the IBM WHEELWRITER typewriters. Development efforts
                 and resulting technical innovations, such as a unique
                 print hammer design which minimizes sensitivities to
                 current variations, are discussed. Included is a
                 discussion of a variable-reluctance stepper motor
                 driver that has selectable damping. A novel scheme for
                 initializing the printwheel and escapement motors is
                 given; this includes sensing the font weight. The
                 electronic architecture of the typewriter and the
                 design of a simplified algorithm to handle the many
                 different keyboards that can be attached to the machine
                 with a minimum amount of data storage are explained.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "C3260B (Electric actuators and final control
                 equipment); C5550 (Printers, plotters and other
                 hard-copy output devices)",
  classification = "705; 732; 745",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Control; electric drives; electric motors, stepping
                 type --- Applications; escapement motors; font weight;
                 hammer design; IBM WHEELWRITER typewriters; keyboards;
                 print; print hammer; printwheel typewriter; selectable
                 damping; stepper motor driver; stepping motors;
                 typewriters; variable-reluctance stepper motor driver;
                 wheelwriter typewriters",
  treatment =    "N New Development; P Practical",
}

@Article{Bohnhoff:1985:SCR,
  author =       "Alan E. Bohnhoff and Donald Croley and Stan Dyer and
                 Tim Green and Randy Maddox and Lynn M. Struttmann",
  title =        "System Controls for a Resistive Ribbon Printer",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "494--508 (or 494--507??)",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The system controls for a printer using the resistive
                 ribbon print technology involve conventional
                 requirements, such as moving the print mechanism
                 relative to the paper, with a new requirement,
                 controlling the electrical energy to the ribbon, an
                 electrothermal component. Other special requirements
                 are dictated by using the same ribbon for hard copy
                 print\slash erase while ensuring that the print and
                 erase operations are acceptable to the user. This paper
                 discusses the design and performance of the system
                 controls for a resistive ribbon printer that was
                 developed for use in an interactive typewriter
                 application and as an output printer for a personal
                 computer.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Information Products Div, Lexington, KY, USA",
  affiliationaddress = "IBM, Information Products Div, Lexington, KY,
                 USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Inf. Products Div., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; electrical energy;
                 erase operations; hard copy print/erase; interactive
                 typewriter; output printer; personal computer; print
                 mechanism; Printers; resistive ribbon printer; system
                 controls; thermal printers; typewriters; typewriters
                 --- Accessories",
  treatment =    "P Practical",
}

@Article{Chieu:1985:ITR,
  author =       "Trieu C. Chieu and O. Sahni",
  title =        "Ink Temperatures in Resistive Ribbon Thermal Transfer
                 Printing",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "509--518",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Knowledge of ink temperatures is important in thermal
                 transfer printing technologies. This paper reports on
                 an experimental technique which uses an infrared
                 radiometric microscope to measure the temperature of
                 ink deposited by the resistive ribbon process on
                 transparent substrates. An examination has been made of
                 the spatial and temporal profiles of ink temperatures
                 as a function of input current, printing speed,
                 substrate materials, and number of active electrodes.
                 The results on a Kapton substrate permit estimation of
                 the ink temperatures reached during printing on paper.
                 The peak ink temperatures are observed to depend
                 linearly on input current and inversely on an
                 approximately linear function of writing speed from 2
                 to 8 in\slash sec. The model permits projections to be
                 made of the current required over a wide range of
                 printing speeds.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Printer Materials
                 Group, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent, Printer
                 Materials Group, Yorktown Heights, NY, USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 731; 745; 804; 941; 944",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment --- Printers; infrared
                 radiometric microscope; ink; ink temperatures; input
                 current; Kapton substrate; printing; printing ---
                 Thermal Effects; printing speed; printing speeds;
                 radiometry; resistive ribbon; resistive ribbon thermal
                 transfer; spatial profiles; Temperature Control;
                 temperature measurement; temporal profiles; thermal
                 printers; thermal transfer printing; transparent
                 substrates",
  treatment =    "X Experimental",
}

@Article{Shih:1985:EPR,
  author =       "Kwang Kuo Shih and Derek B. Dove",
  title =        "Electrical Properties of Resistive Ribbon",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "519--526",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In resistive ribbon thermal transfer printing, a
                 printhead consisting of an array of electrodes passes
                 current into a thin ribbon to generate heat for
                 transferring ink to paper. The ribbon is made of a
                 polymeric material containing carbon black so as to be
                 conducting, and has aluminum deposited on one side of
                 the ribbon for a base contact. The electrical
                 conduction processes within the ribbon are discussed.
                 Current-voltage measurements have been made with
                 electrodes of various types in order to separate
                 effects due to contact resistance, aluminum\slash
                 resistive ribbon interfacial resistance, and bulk
                 conduction in the resistive ribbon. Measurements have
                 been made over a range of frequency and temperature to
                 determine the basic conduction mechanisms. A model of
                 conduction is presented that is in qualitative
                 agreement with the data.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, I/O Dep, Yorktown
                 Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent, I/O Dep,
                 Yorktown Heights, NY, USA",
  classcodes =   "B7310J (Impedance and admittance measurement); C5550
                 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "701; 722; 745",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bulk conduction; carbon black; computer peripheral
                 equipment; contact resistance; electric properties;
                 electrical conduction; electrical conductivity
                 measurement; interfacial resistance; polymeric
                 material; polymers; printers; Printers; printhead;
                 printing --- Thermal Effects; processes; resistive
                 ribbon; resistive ribbon thermal transfer printing;
                 thermal; thermal transfer printing",
  treatment =    "X Experimental",
}

@Article{Laff:1985:TBR,
  author =       "Robert A. Laff and Claus D. Makowka",
  title =        "Thermal Behavior of Resistive Ribbon for Single-Stylus
                 Excitation",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "5",
  pages =        "527--537",
  month =        sep,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper provides a quantitative description of the
                 heating and cooling behavior of the resistive ribbon
                 used in resistive ribbon thermal transfer printing.
                 Since the focus is upon the ribbon, this description
                 has been facilitated by substituting a single, tapered
                 tungsten stylus as a model for a single printhead
                 element. The experiment used an infrared spot pyrometer
                 to measure ribbon surface temperatures downstream from
                 the stylus while a laminate of ribbon and paper was
                 continuously moved beneath the stylus and subjected to
                 current pulses. Measured cooling rates under
                 steady-state excitation at different ribbon velocities
                 showed a behavior consistent with two simple analytic
                 models which describe heat loss into the stylus during
                 heating and two-dimensional diffusion into a half-plane
                 during cooling. A time-dependent computer simulation
                 using finite-element methods was used to provide a more
                 detailed description of the process by taking into
                 account the local geometry of the heat input
                 distribution and the layered nature of the ribbon-paper
                 laminate.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Research Cent, Input-Output
                 Technologies Dep, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Thomas J. Watson Research Cent,
                 Input-Output Technologies Dep, Yorktown Heights, NY,
                 USA",
  classcodes =   "B7230C (Photodetectors); B7320R (Thermal variables
                 measurement); C5550 (Printers, plotters and other
                 hard-copy output devices)",
  classification = "722; 745",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; cooling; digital
                 simulation; excitation; finite-element methods; heat
                 loss; heating; infrared spot; infrared spot pyrometer;
                 local geometry; Printers; printhead; printing ---
                 Equipment; pyrometer; pyrometers; resistive ribbon;
                 ribbon surface temperatures; single printhead;
                 single-stylus excitation; steady-state; temperature
                 distributions; temperature measurement; thermal
                 printers; thermal transfer printing; three-dimensional;
                 time-dependent computer simulation",
  treatment =    "X Experimental",
}

@Article{Patel:1985:ACA,
  author =       "Arvind M. Patel",
  title =        "Adaptive Cross-Parity (Axp) Code for a High-Density
                 Magnetic Tape Subsystem",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "6",
  pages =        "546--562",
  month =        nov,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an error-correction system,
                 called adaptive cross-parity (AXP) code, for the IBM
                 3480, a new high-density 18-track tape storage
                 subsystem. Redundancy is applied to two interleaved
                 sets of nine tracks in the same proportion as that in
                 the previous IBM 3420 tape machines. The coding
                 structure, however, is simpler, for it avoids the
                 complex computations of Galois fields. The coding
                 structure is based on a concept of interacting vertical
                 and cross-parity checks, where the cross-parity checks
                 span both sets of tracks and are use in either set in
                 an adaptive manner. As a result, the overall
                 error-correcting capability is improved without
                 increasing the redundancy. Decoding, in which simple
                 parity equations are processed, is designed to progress
                 iteratively.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B6120B (Codes); C5320C
                 (Storage on moving magnetic media)",
  classification = "721; 722; 723; 752",
  corpsource =   "UIBM Div. of Gen. Products, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "18-track; adaptive cross-parity (AXP) code; adaptive
                 cross-parity code; codes, symbolic --- Error
                 Correction; compact cartridge; correction codes;
                 cross-parity checks; data recording; data storage,
                 magnetic; decoding; encoding; erroneous track; error;
                 error correction; error-correction system;
                 high-density; high-density magnetic tape; IBM 3480;
                 magnetic recording; magnetic tape; magnetic tape
                 storage; redundancy; structure; subsystem; Tape; tape
                 storage; tape storage subsystem; vertical and
                 cross-parity checks",
  treatment =    "P Practical",
}

@Article{Schneider:1985:WEH,
  author =       "Richard C. Schneider",
  title =        "Write Equalization in High-Linear-Density Magnetic
                 Recording",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "6",
  pages =        "563--568",
  month =        nov,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Equalization has been used on the read side of a
                 magnetic-recording channel to obtain a desired signal
                 shape at the detector. Compensation on the write side
                 has, for the most part, been limited to moving
                 transition locations to offset read-signal peak shifts.
                 This paper presents a new method of equalization on the
                 write side through the addition of pulses at strategic
                 locations on the write waveform. The resulting write
                 current continues to be a two-level signal, so AC bias
                 is not required. A linear transfer function can be
                 derived for these write equalizers. This enables the
                 recording-channel designer to partition the
                 equalization more optimally between the write and read
                 sides. The principal benefit of write equalization is
                 that the read-flux-amplitude differences between high
                 and low densities are significantly reduced. This
                 permits maximum use of the linear operating region of
                 the magnetoresistive read head.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media)",
  classification = "721; 722",
  corpsource =   "IBM Div. of Gen. Products, Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data recording; data storage, magnetic; equalisers;
                 equalization; head; HF boost; high-density recording;
                 linear operating region; linear transfer function;
                 magnetic; magnetic recording; magnetic-;
                 magnetoresistive read; Performance; read side;
                 recording channel; tape storage; transfer functions;
                 write; write current; write equalization; write side",
  treatment =    "P Practical",
}

@Article{Carnevali:1985:IPS,
  author =       "P. Carnevali and L. Coletti and S. Patarnello",
  title =        "Image Processing by Simulated Annealing",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "6",
  pages =        "569--579",
  month =        nov,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "It is shown that simulated annealing, a statistical
                 mechanics method recently proposed as a tool in solving
                 complex optimization problems, can be used in problems
                 arising in image processing. The problems examined are
                 the estimation of the parameters necessary to describe
                 a geometrical pattern corrupted by noise, the smoothing
                 of bi-level images, and the process of halftoning a
                 continuous-level image. The analogy between the system
                 to be optimized and an equivalent physical system,
                 whose ground state is sought, is put forward by showing
                 that some of these problems are formally equivalent to
                 ground state problems for two-dimensional Ising spin
                 systems. In the case of low snr's, the methods proposed
                 give better results than those obtained with standard
                 techniques.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition)",
  classification = "723; 741",
  corpsource =   "IBM Italy, Sci. Center, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bi-level images; bilevel image smoothing; complex;
                 continuous-level image; corruption; geometrical;
                 geometrical pattern; halftoning; Image Analysis; image
                 processing; noise; optimisation; optimization problems;
                 parameter estimation; pattern; picture processing;
                 simulated annealing; simulation; statistical mechanics;
                 statistical mechanics method",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bates:1985:JAT,
  author =       "R. J. S. Bates and L. A. Sauer",
  title =        "Jitter Accommodation in Token-Passing Ring {LANs}",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "6",
  pages =        "580--587",
  month =        nov,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a token-passing ring Local Area Network (LAN) each
                 message accumulates phase jitter as it travels around
                 the ring. Unlike typical digital transmission systems,
                 which tend to have random data traffic, ring systems
                 carrying computer-generated traffic may have long
                 strings of repetitive-pattern data. This traffic
                 produces a jitter amplitude which is a function of the
                 message statistics and the transmission characteristics
                 of the physical layer. For the system to be stable,
                 this jitter must be controlled. This paper describes
                 the repetitive-pattern jitter generation and
                 accumulation process and gives a methodology for
                 designing the physical layer components to accommodate
                 it.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620L (Local area
                 networks)",
  classification = "716; 717; 718; 723",
  corpsource =   "IBM Div. of Res., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accumulation process; characteristics; computer
                 networks; computer-generated traffic; data
                 communication; data communication systems; digital
                 communication systems; digital transmission systems;
                 IEEE 802.5 standard; interference (signal); jitter
                 accommodation; LAN; local area network; local area
                 networks; Local Networks; message statistics; phase
                 jitter; physical layer components design;
                 repetitive-pattern jitter generation; ring LANs;
                 systems; token-passing; token-passing ring;
                 transmission",
  treatment =    "P Practical; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Matino:1985:AHC,
  author =       "Haruhiro Matino",
  title =        "Analysis of the Holding Current in {CMOS} Latch-Up",
  journal =      j-IBM-JRD,
  volume =       "29",
  number =       "6",
  pages =        "588--592",
  month =        nov,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The holding current in CMOS latch-up with or without
                 well and\slash or substrate bias has been examined.
                 Measurements indicate that the holding current
                 increases significantly with reverse bias and low
                 shunting base resistance. It is shown that a previous
                 equation for the holding current is inaccurate, and a
                 new equation for holding current with bias is
                 presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570D (CMOS integrated circuits)",
  classification = "713; 714",
  corpsource =   "IBM Japan Ltd., Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Analysis; CMOS integrated circuits; CMOS latch-up;
                 holding current; integrated circuits; low shunting base
                 resistance; monolithic IC; reverse bias; semiconductor
                 devices, MOS",
  treatment =    "X Experimental",
}

@Article{Hosler:1985:DPS,
  author =       "W. H{\"o}sler and R. J. Behm and E. Ritter",
  title =        "Defects on the {Pt(100)} Surface and their Influence
                 on Surface Reactions --- a Scanning Tunneling
                 Microscopy Study",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "403--410",
  month =        jul,
  year =         "1985",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 13 12:46:56 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Structural differences between a clean, reconstructed
                 Pt(100) surface and one exhibiting chemical or
                 structural irregularities have been identified by means
                 of a scanning tunneling microscope. The
                 (temperature-dependent) defect structure of a surface
                 which had undergone a phase transition involving mass
                 transport was characterized and compared to results
                 obtained using other techniques. The catalytic activity
                 of surface step sites was probed by the thermal
                 decomposition of ethylene. The resulting surface
                 roughening and buildup of carbon, which could be
                 resolved in STM images, showed that the decomposition
                 proceeds from terrace edges.",
  acknowledgement = ack-nhfb,
  affiliation =  "Univ of Munich, Munich, West Ger",
  affiliationaddress = "Univ of Munich, Munich, West Ger",
  classification = "513; 547; 741; 804; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "catalytic activity; design; ethylene; mass transport;
                 measurement; Microscopic Examination; platinum and
                 alloys; scanning tunneling microscopy study; surface
                 reactions; thermal decomposition",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Physics \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Engineering",
}

@Article{Walker:1986:KSP,
  author =       "Adrian Walker",
  title =        "Knowledge systems: Principles and practice",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "2--13",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We describe what is expected of a knowledge-based
                 expert system, and the components from which such a
                 system is constructed. We give a view of how an
                 interplay between principles and practice has helped
                 the knowledge system field to develop, and give simple
                 examples to show that reasoning techniques based on
                 formal logic provide a useful coupling between
                 scientific and engineering work in the field. The
                 examples are about logic programming, knowledge
                 representation, judgmental reasoning, and about three
                 methods by which a system can acquire the knowledge it
                 needs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6170 (Expert systems); C7000 (Computer
                 applications)",
  classification = "721; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "artificial intelligence; computer metatheory ---
                 Formal Logic; design; Expert Systems; expert systems;
                 formal logic; judgmental reasoning; knowledge
                 representation; knowledge system; knowledge systems;
                 knowledge-based expert system; languages; logic
                 programming; principles; reasoning techniques",
  subject =      "I.2.0 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, General",
  treatment =    "B Bibliography; P Practical",
}

@Article{Ennis:1986:CRE,
  author =       "R. L. Ennis and J. H. Griesmer and S. J. Hong and M.
                 Karnaugh and J. K. Kastner and D. A. Klein and K. R.
                 Milliken and M. I. Schor and H. M. {Van Woerkom}",
  title =        "A continuous real-time expert system for computer
                 operations",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "14--28",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Yorktown Expert System\slash MVS Manager (or
                 YES\slash MVS for short) is a continuous real-time
                 expert system that exerts active control over a
                 computing system and provides advice to computer
                 operators. YES\slash MVS provides advice on routine
                 operations and detects, diagnoses, and responds to
                 problems in the computer operator's domain. This paper
                 discusses the YES\slash MVS system, its domain
                 application, and issues that arise in the design and
                 development of an expert system that runs continuously
                 in real time.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7430 (Computer engineering)",
  classification = "722; 723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "artificial intelligence; computer operating
                 procedures; computer operating systems; computer
                 operations; computer operators; design; development;
                 Expert System; expert systems; Expert Systems;
                 languages; LISP; management; real-time; real-time
                 expert system; systems; YES/MVS; Yorktown",
  subject =      "I.2.m Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Miscellaneous \\ H.4.2 Information
                 Systems, INFORMATION SYSTEMS APPLICATIONS, Types of
                 Systems, Decision support \\ I.2.5 Computing
                 Methodologies, ARTIFICIAL INTELLIGENCE, Programming
                 Languages and Software, OPS5 \\ C.3 Computer Systems
                 Organization, SPECIAL-PURPOSE AND APPLICATION-BASED
                 SYSTEMS, Real-time systems",
  treatment =    "A Application; P Practical",
}

@Article{Hirsch:1986:IKB,
  author =       "P. Hirsch and W. Katke and M. Meier and S. Snyder and
                 R. Stillman",
  title =        "Interfaces for Knowledge-Base Builders' Control
                 Knowledge and Application-Specific Procedures",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "29--38",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Expert System Environment\slash VM is an expert system
                 shell --- a general-purpose system for constructing and
                 executing expert system applications. An application
                 expert has both factual knowledge about an application
                 and knowledge about how that factual knowledge should
                 be organized and processed. Many applications require
                 application-dependent procedures to access databases or
                 to do specialized processing. An important and novel
                 part of Expert System Environment\slash VM is the
                 technique used to allow the expert or knowledge-base
                 builder to enter the control knowledge and to interface
                 with application-dependent procedures. This paper
                 discusses these high-level interfaces for the
                 knowledge-base builder.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6170 (Expert systems); C7000 (Computer
                 applications)",
  classification = "721; 722; 723",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "application expert; application-dependent procedures;
                 artificial intelligence; computer interfaces; design;
                 ESCE/VM; ESDE/VM; Expert System Environment/VM; expert
                 systems; Expert Systems; factual knowledge; general-;
                 high level; high-level interfaces; interfaces;
                 knowledge-base builder; LISP; purpose system",
  subject =      "I.2.m Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Miscellaneous \\ H.1.2 Information
                 Systems, MODELS AND PRINCIPLES, User/Machine Systems",
  treatment =    "A Application; P Practical",
}

@Article{Guenthner:1986:TRK,
  author =       "Franz G{\"u}nthner and Hubert Lehmann and Wolfgang
                 Sch{\"o}nfeld",
  title =        "A theory for the representation of knowledge",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "39--56",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "How to represent knowledge is one of the key questions
                 in the construction of expert systems. Its solution
                 depends on a number of factors, the most important of
                 which are how knowledge is to be acquired and how it is
                 to be used. Since we are interested in the use of
                 natural language for communication with computers, we
                 require from a formalism suggested for knowledge
                 representation that it be suitable as a target for the
                 systematic translation from natural language
                 expressions. We propose a theory, called Discourse
                 Representation Theory (DRT), originally developed by
                 Kamp to analyze natural language discourse, as a means
                 to represent knowledge in an expert system. With DRT it
                 has been possible to solve certain cases of contextual
                 relations which have puzzled linguists and logicians
                 for a long time. We give a definition of DRT and
                 describe the rules used to translate from natural
                 language to Discourse Representation Structures (DRSs),
                 the central notion of the theory.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1230 (Artificial intelligence); C4210 (Formal logic);
                 C4290 (Other computer theory); C6170 (Expert systems)",
  classification = "721; 723",
  corpsource =   "T{\"u}bingen Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; artificial intelligence; automata theory;
                 computational linguistics; computer metatheory;
                 context-sensitive languages; deductive theory; design;
                 discourse representation; discourse representation
                 structures; discourse representation theory; expert
                 system; Expert Systems; expert systems; formal logic;
                 knowledge engineering; knowledge representation;
                 language; languages; natural; natural language;
                 predicate logic; structures; theory",
  subject =      "I.2.4 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Knowledge Representation Formalisms and
                 Methods, Representations (procedural and rule-based)
                 \\
                 I.2.1 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
                 Applications and Expert Systems, Natural language
                 interfaces \\ I.2.3 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Deduction and Theorem Proving,
                 Deduction",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Buettiker:1986:TTT,
  author =       "Markus Buettiker and Rolf Landauer",
  title =        "Traversal Time for Tunneling",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "45l-454",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Tunneling of carriers through a barrier is
                 characterized not only by a transmission and reflection
                 probability, but also by the time it takes a carrier to
                 traverse the barrier. Recent work which discusses the
                 traversal time is summarized, and its relevance is
                 highlighted by discussing several tunneling
                 phenomena.",
  acknowledgement = ack-nhfb,
  classification = "714; 931; 933",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "quantum theory; semiconductor devices; traversal time;
                 Tunneling",
}

@Article{Sowa:1986:ISI,
  author =       "John F. Sowa and Eileen C. Way",
  title =        "Implementing a Semantic Interpreter Using Conceptual
                 Graphs",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "57--69",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A parse applies grammar rules to generate a parse that
                 shows the syntactic structure of a sentence. This paper
                 describes a semantic interpreter that starts with a
                 parse tree and generates conceptual graphs that
                 represent the meaning of the sentence. To generate
                 conceptual graphs, the interpreter joins canonical
                 graphs associated with each word of input. The result
                 is a large graph that represents the entire sentence.
                 During the interpretation, the parse tree serves as a
                 guide to show how the graphs are joined. Both the
                 front-end parser and the back-end semantic interpreter
                 are written in the Programming Language for Natural
                 Language Processing (PLNLP). (Auhtor abstract)",
  acknowledgement = ack-nhfb,
  classcodes =   "C1160 (Combinatorial mathematics); C4210 (Formal
                 logic); C6150C (Compilers, interpreters and other
                 processors)",
  classification = "721; 723",
  corpsource =   "IBM Syst. Res. Inst., Thornwood, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(mathematics); artificial intelligence; automata
                 theory; canonical graphs; computer metatheory;
                 conceptual graphs; design; front-end parser; grammar
                 rules; Grammars; grammars; interpreter; languages;
                 natural language processing; natural languages; parse
                 tree; program interpreters; semantic; semantic
                 interpreter; sentence; syntactic structure; theory;
                 trees; word",
  subject =      "G.2.2 Mathematics of Computing, DISCRETE MATHEMATICS,
                 Graph Theory \\ I.2.1 Computing Methodologies,
                 ARTIFICIAL INTELLIGENCE, Applications and Expert
                 Systems, Natural language interfaces \\ F.4.2 Theory of
                 Computation, MATHEMATICAL LOGIC AND FORMAL LANGUAGES,
                 Grammars and Other Rewriting Systems, Parsing \\ D.3.4
                 Software, PROGRAMMING LANGUAGES, Processors,
                 Interpreters",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fargues:1986:CGS,
  author =       "Jean Fargues and Marie-Claude Landau and Anne Dugourd
                 and Laurent Catach",
  title =        "Conceptual Graphs for Semantics and Knowledge
                 Processing",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "70--79",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses the representational and
                 algorithmic power of the conceptual graph model for
                 natural language semantics and knowledge processing.
                 Also described is a Prolog-like resolution method for
                 conceptual graphs, which allows one to perform
                 deduction on large semantic domains. The interpreter
                 developed is similar to a Prolog interpreter in which
                 the terms are any conceptual graphs and in which the
                 unification algorithm is replaced by a specialized
                 algorithm for conceptual graphs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1160 (Combinatorial mathematics); C4210 (Formal
                 logic); C4240 (Programming and algorithm theory);
                 C6150C (Compilers, interpreters and other processors)",
  classification = "721; 723",
  corpsource =   "IBM France, Sci. Center, Paris, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm theory; algorithmic power; algorithms;
                 artificial intelligence; automata theory; computer
                 metatheory; conceptual graph; conceptual graphs;
                 design; engineering; grammars; Grammars; graph theory;
                 interpreter; knowledge; knowledge processing;
                 languages; method; natural language; natural languages;
                 program interpreters; Prolog-like resolution;
                 PROLOG-like resolution; semantics; theory",
  subject =      "I.2.4 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Knowledge Representation Formalisms and
                 Methods \\ F.3.2 Theory of Computation, LOGICS AND
                 MEANINGS OF PROGRAMS, Semantics of Programming
                 Languages \\ G.2.2 Mathematics of Computing, DISCRETE
                 MATHEMATICS, Graph Theory \\ D.3.4 Software,
                 PROGRAMMING LANGUAGES, Processors, Interpreters",
  treatment =    "T Theoretical or Mathematical",
}

@Article{vanEmdeBoas:1986:SEH,
  author =       "Chica {van Emde Boas} and Peter {van Emde Boas}",
  title =        "Storing and evaluating {Horn}-clause rules in a
                 relational database",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "80--92",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a practical approach to storing
                 and evaluating Horn-clause rules in a relational
                 database system. The intention is to give an outline of
                 what needs to be added to an existing relational
                 database system to allow it to support full logic
                 programming functions. Implementation issues for each
                 new function are discussed. We show how Horn-clause
                 rules can be translated into database commands without
                 recourse to semantics and how their evaluation can be
                 performed in the database itself. This brings the
                 complete logic programming environment within reach of
                 the database management system, allowing data and rule
                 sharing, concurrency control, recovery procedures,
                 etc., to be used. New is that the complete logic
                 programming environment is incorporated into the
                 database system. IBM Business System 12, extended in
                 this way, may be a suitable vehicle for expert system
                 applications.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C4250 (Database theory); C6115
                 (Programming support); C6160D (Relational databases)",
  classification = "721; 723",
  corpsource =   "IBM Inf. Network Services, Support Center Uithoorn,
                 Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "artificial intelligence --- Expert Systems; computer
                 metatheory; concurrency control; data sharing; database
                 commands; database management system; database systems;
                 database theory; design; environments; Horn-clause
                 rules; horn-clause rules; languages; logic; logic
                 programming; programming; recovery procedures;
                 Relational; relational database; relational databases;
                 rule sharing; theory",
  subject =      "H.2.m Information Systems, DATABASE MANAGEMENT,
                 Miscellaneous \\ F.4.1 Theory of Computation,
                 MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Mathematical
                 Logic, Logic programming \\ I.2.3 Computing
                 Methodologies, ARTIFICIAL INTELLIGENCE, Deduction and
                 Theorem Proving, Logic programming",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Eddy:1986:SRB,
  author =       "William F. Eddy and Gabriel P. Pei",
  title =        "Structures of Rule-Based Belief Functions",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "93--101",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Shafer's theory of evidential reasoning has recently
                 received attention as a possible model for
                 probabilistic reasoning in expert system applications.
                 This paper discusses the difficulties of implementing
                 Shafer's belief functions in the context of the most
                 common form of expert system, rule-based systems. Two
                 most important problems are: the representation of the
                 expert's subjective degrees of belief corresponding to
                 his expressed rules, and the computational complexity
                 of the inference mechanism for combining evidence. We
                 argue that a potential approach for dealing with both
                 problems is given by introducing constraints on the
                 structure of the belief functions. These constraints,
                 along with the expressed rules and the elicited belief
                 values, form the expert's total knowledge.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C4290 (Other computer theory);
                 C6170 (Expert systems); C7000 (Computer applications)",
  classification = "721; 723",
  corpsource =   "Carnegie-Mellon Univ., Pittsburg, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "artificial intelligence; belief functions;
                 computational complexity; computer metatheory; design;
                 evidential reasoning; expert system; Expert Systems;
                 expert systems; expert's; formal logic; inference
                 mechanism; probabilistic reasoning; probability;
                 reasoning; rule-based systems; Shafer's belief
                 functions; structural constraints; theory; total
                 knowledge",
  subject =      "I.2.4 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Knowledge Representation Formalisms and
                 Methods, Representations (procedural and rule-based)
                 \\
                 I.2.3 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
                 Deduction and Theorem Proving, Uncertainty, ``fuzzy,''
                 and probabilistic reasoning",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Diel:1986:ECA,
  author =       "H. Diel and N. Lenz and H. M. Welsch",
  title =        "An Experimental Computer Architecture Supporting
                 Expert Systems and Logic Programming",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "1",
  pages =        "102--111",
  month =        jan,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a set of function primitives
                 which have been designed for support of expert systems
                 and logic programs. The functions could be offered as
                 part of the computer architecture by implementing them
                 in microcode and partially in hardware. The functions
                 are primarily oriented towards support of logic
                 programming languages such as Prolog for implementing
                 expert systems. Emphasis is given to supporting the
                 parallel execution of expert system applications by
                 multiple processors. The concepts are based on the
                 Concurrent Data Access Architecture (CDAA). It is shown
                 that OR-parallelism, as well as AND-parallelism, can be
                 supported.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C5440 (Multiprocessing
                 systems); C6110 (Systems analysis and programming);
                 C6170 (Expert systems); C7000 (Computer applications)",
  classification = "721; 722; 723",
  corpsource =   "IBM Germany, Boblingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "AND-; artificial intelligence; computer architecture;
                 computer programming languages; concurrent data access
                 architecture; design; experimentation; expert systems;
                 Expert Systems; function primitives; logic programming;
                 microcode; multiple processors; OR-parallelism;
                 parallel processing; parallelism; PROLOG; Prolog;
                 theory",
  subject =      "I.2.3 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Deduction and Theorem Proving, Logic
                 programming \\ F.4.1 Theory of Computation,
                 MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Mathematical
                 Logic, Logic programming \\ F.3.3 Theory of
                 Computation, LOGICS AND MEANINGS OF PROGRAMS, Studies
                 of Program Constructs \\ F.1.2 Theory of Computation,
                 COMPUTATION BY ABSTRACT DEVICES, Modes of Computation,
                 Parallelism",
  treatment =    "X Experimental",
}

@Article{Agarwal:1986:NSV,
  author =       "Ramesh C. Agarwal and James W. Cooley and Fred G.
                 Gustavson and James B. Shearer and Gordon Slishman and
                 Bryant Tuckerman",
  title =        "New Scalar and Vector Elementary Functions for the
                 {IBM System\slash 370}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "126--144",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76W05",
  MRnumber =     "840 341",
  bibdate =      "Sat Feb 24 09:37:37 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "See clarification \cite{Agarwal:1987:CNS}.",
  abstract =     "Algorithms have been developed to compute short-and
                 long-precision elementary functions: SIN, COS, TAN,
                 COTAN, LOG, LOG10, EXP, POWER, SQRT, ATAN, ASIN, ACOS,
                 ATAN2, and CABS, in scalar (28 functions) and vector
                 (22 functions) mode. They have been implemented as part
                 of the new VS FORTRAN library recently announced along
                 with the IBM 3090 Vector Facility. These algorithms are
                 essentially table-based algorithms. An important
                 feature of these algorithms is that they produce
                 bitwise-identical results on scalar and vector
                 System\slash 370 machines. Of these, for five functions
                 the computed value result is always the correctly
                 rounded value of the infinite-precision result. For the
                 rest of the functions, the value returned is one of the
                 two floating-point neighbors bordering the
                 infinite-precision result, which implies exact results
                 if they are machine-representable. For the five
                 correctly rounded elementary functions, scalar and
                 vector algorithms are designed independently to
                 optimize performance in each case.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C7310 (Mathematics
                 computing)",
  classification = "723",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "ACOS; Algorithms; algorithms; ASIN; ATAN; ATAN2;
                 bitwise-identical results; CABS; computer metatheory;
                 computer programming; computer programming languages
                 --- fortran; COS; COTAN; design; elementary functions;
                 EXP; FORTRAN; fortran library; functions; IBM
                 computers; IBM System/370; infinite-precision result;
                 LOG; LOG10; mainframes; measurement; performance;
                 POWER; scalar elementary functions; SIN; SQRT;
                 subroutines; table-based algorithms; TAN; vector
                 elementary; VS FORTRAN library",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ I.1.2 Computing Methodologies, ALGEBRAIC
                 MANIPULATION, Algorithms \\ F.3.3 Theory of
                 Computation, LOGICS AND MEANINGS OF PROGRAMS, Studies
                 of Program Constructs, Functional constructs \\ C.1.2
                 Computer Systems Organization, PROCESSOR ARCHITECTURES,
                 Multiple Data Stream Architectures (Multiprocessors),
                 Array and vector processors",
  treatment =    "N New Development; P Practical",
}

@Article{Agarwal:1986:FTC,
  author =       "Ramesh C. Agarwal and James W. Cooley",
  title =        "{Fourier} Transform and Convolution Subroutines for
                 the {IBM 3090} {Vector Facility}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "145--162",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65W05 (65T05 94A11)",
  MRnumber =     "840 342",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A set of highly optimized subroutines for digital
                 signal processing has been included in the Engineering
                 and Scientific Subroutine Library (ESSL) for the IBM
                 3090 Vector Facility. These include FORTRAN-callable
                 subroutines for Fourier transforms, convolution, and
                 correlation. The subroutines are designed and tuned for
                 optimal vector and cache performance. Speedups of up to
                 9 one-half times over scalar performance on the 3090
                 have been obtained.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5260 (Digital signal processing); C6140D (High level
                 languages)",
  classification = "723; 921",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; cache performance; computer metatheory;
                 computer programming; computerised signal processing;
                 convolution; convolution subroutines; correlation;
                 design; digital signal processing; Facility; FORTRAN;
                 FORTRAN-callable; fortran-callable subroutines; Fourier
                 transform; Fourier transforms; IBM 3090; IBM 3090
                 Vector; IBM computers; mathematical transformations ---
                 Fourier Transforms; measurement; performance;
                 Subroutines; subroutines; theory; vector and cache
                 performance; vector facility",
  subject =      "D.3.3 Software, PROGRAMMING LANGUAGES, Language
                 Constructs, Procedures, functions, and subroutines \\
                 C.3 Computer Systems Organization, SPECIAL-PURPOSE AND
                 APPLICATION-BASED SYSTEMS, Signal processing systems
                 \\
                 I.5.4 Computing Methodologies, PATTERN RECOGNITION,
                 Applications, Signal processing \\ F.1.2 Theory of
                 Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
                 Computation, Alternation and nondeterminism",
  treatment =    "P Practical",
}

@Article{Scarborough:1986:VFC,
  author =       "Randolph G. Scarborough and Harwood G. Kolsky",
  title =        "A vectorizing {Fortran} compiler",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "163--171",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65W05",
  MRnumber =     "840 343",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a vectorizing Fortran compiler
                 for the IBM 3090 Vector Facility. Opportunities for
                 vectorization are investigated for eight levels of
                 DO-loop nesting. Recurrences in inner loops do not
                 prevent vectorization of outer loops. A least-cost
                 analysis determines from the opportunities identified
                 which specific vectorization will result in the fastest
                 execution. The normal optimization phases of the
                 compiler produce much of the information needed for the
                 vectorization analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "722; 723; 921",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer operating systems; computer programming
                 languages --- fortran; design; DO-; do-loop nesting;
                 FORTRAN; fortran compiler; IBM 3090 Vector Facility;
                 inner loops; languages; least-cost analysis; loop
                 nesting; mathematical techniques --- Vectors;
                 optimization phases; program compilers; Program
                 Compilers; vectorization; vectorizing Fortran
                 compiler",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, FORTRAN \\ D.3.4 Software, PROGRAMMING
                 LANGUAGES, Processors, Compilers",
  treatment =    "P Practical",
}

@Article{Gazdag:1986:SMI,
  author =       "J. Gazdag and G. Radicati and P. Sguazzero and H. H.
                 Wang",
  title =        "Seismic Migration on the {IBM 3090} {Vector
                 Facility}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "172--183",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Seismic prospecting aims at determining the structure
                 of the earth from indirect measurements. Acoustic wave
                 fields are generated at the surface, penetrate the
                 earth, and are backscattered by the earth's
                 inhomogeneities. The data recorded at the surface are
                 processed in a complex sequence of steps among which is
                 seismic migration. This is a wave depropagation process
                 that permits the localization in depth of the origin of
                 the diffraction events measured at the surface. This
                 paper presents an overview of the major wave-equation
                 migration methods. The most frequently executed
                 algorithms or kernels on which the execution speed
                 depends most crucially are given attention. The speedup
                 resulting from scalar-to-vector formulation is
                 presented over wide ranges of dimensionality for linear
                 tridiagonal equation solvers, Fourier transforms, and
                 convolution operations. The vectorizability and
                 resulting speedup are also addressed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A9130R (Controlled source seismology); A9385
                 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B7710
                 (Geophysical techniques and equipment); C7340
                 (Geophysics computing)",
  classification = "481; 484; 723",
  corpsource =   "IBM Sci., Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3090 Vector Facility; acoustic wave fields;
                 algorithms; computing; concurrent processing;
                 convolution operations; depropagation; design;
                 diffraction events; equation migration methods;
                 exploration; Fourier domain; Fourier Transforms;
                 geophysical prospecting; geophysical techniques;
                 geophysics; geophysics computing; IBM 3090 Vector
                 Facility; IBM 3090 vector facility; localization;
                 measurement; multilevel; Multitasking Facility;
                 parallelism; performance; scalar-to-vector formulation;
                 Seismic; seismic migration; seismic prospecting;
                 seismology; seismology --- Computer Applications;
                 theory; tridiagonal equation solvers; wave; wave
                 depropagation; wave-; wave-equation migration",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Earth and atmospheric sciences \\ C.1.2
                 Computer Systems Organization, PROCESSOR ARCHITECTURES,
                 Multiple Data Stream Architectures (Multiprocessors),
                 Array and vector processors",
  treatment =    "X Experimental",
}

@Article{Efrat:1986:PIL,
  author =       "Ilan Efrat and Miron Tismenetsky",
  title =        "Parallel Iterative Linear Solvers for Oil Reservoir
                 Models",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "184--192",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65W05 (65F10 76S05)",
  MRnumber =     "840 344",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper suggests a new algorithm for solving sparse
                 linear systems which is readily parallelized and is
                 efficient for matrices arising in such domains as
                 reservoir modeling. The algorithm is a variant of the
                 incomplete block factorization technique, accelerated
                 by biconjugate gradient iterations or by another
                 acceleration method. Implementation on a vector
                 computer such as the IBM 3090 Vector Facility is
                 described. We suggest some refinements of known
                 preconditioning methods enabling their parallel
                 computation. Numerical experiments are presented to
                 display the performance of the suggested methods.
                 Attention is given to fully implicit, multiphase models
                 which yield asymmetrical systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7440 (Civil and mechanical engineering computing)",
  classification = "441; 512; 723",
  corpsource =   "IBM Israel, Sci. Center, Haifa, Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Biconjugate Gradient; block factorization;
                 block factorization technique; civil engineering
                 computing; computer simulation --- Applications;
                 design; experimentation; FORTRAN; IBM 3090 Vector
                 Facility; incomplete; iterations; iterative linear
                 solvers; iterative methods; Mathematical Models; matrix
                 algebra; measurement; multiphase models; oil reservoir;
                 oil reservoir models; preconditioning methods;
                 reservoirs; sparse linear systems; theory; vector
                 computer",
  subject =      "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Modes of Computation, Parallelism \\ G.1.0
                 Mathematics of Computing, NUMERICAL ANALYSIS, General,
                 Parallel algorithms \\ G.1.3 Mathematics of Computing,
                 NUMERICAL ANALYSIS, Numerical Linear Algebra, Linear
                 systems (direct and iterative methods)",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Martin:1986:MCP,
  author =       "William R. Martin and Paul F. Nowak and James A.
                 Rathkopf",
  title =        "{Monte Carlo} Photon Transport on a Vector
                 Supercomputer",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "193--202",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of `event-based' algorithms for particle
                 transport Monte Carlo methods has allowed the
                 successful adaptation of these methods to vector
                 supercomputers. An alternative algorithm for the
                 specific application of photon transport in an
                 axisymmetric inertially confined fusion plasma has been
                 developed and implemented on a vector supercomputer.
                 The new algorithm is described; its unique features are
                 discussed and compared with existing vectorized
                 algorithms for Monte Carlo. Numerical results are
                 presented illustrating its efficiency on a vector
                 supercomputer, relative to an optimized scalar Monte
                 Carlo algorithm that was developed for this purpose.",
  acknowledgement = ack-nhfb,
  classcodes =   "A5225F (Plasma transport properties); A5265 (Plasma
                 simulation); C7320 (Physics and chemistry computing)",
  classification = "722; 723; 921; 922; 932",
  corpsource =   "Dept. of Nucl. Eng., Michigan Univ., Ann Arbor, MI,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "'event-based' algorithms; axisymmetric inertially
                 confined fusion plasma; computer systems, digital ---
                 Applications; mathematical techniques --- Algorithms;
                 Monte Carlo methods; monte carlo methods; Monte Carlo
                 photon transport; particle; photon transport; photons;
                 physics computing; plasma simulation; plasma transport
                 processes; supercomputer; transport; Transport
                 Properties; vector supercomputer; vectorized
                 algorithms",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Bradshaw:1986:CMP,
  author =       "R. Bradshaw and B. Bhushan and C. Kalthoff and M.
                 Warne",
  title =        "Chemical and Mechanical Performance of Flexible
                 Magnetic Tape Containing Chromium Dioxide",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "203--216",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The development of a magnetic-recording tape using
                 chromium dioxide suitable for use with the tape drive
                 of the IBM 3480 Magnetic Tape Subsystem was found to
                 require optimization of the chemical and mechanical
                 properties of the coating. This paper discusses the
                 role of chromium dioxide in the oxidative and
                 hydrolytic degradation of the polyesterpolyurethane
                 binders used in most flexible tape coatings, and the
                 subsequent necessity for binder selection to eliminate
                 these degradative effects. In addition to the chemical
                 behavior, the paper discusses the role of the
                 interaction of the chromium dioxide with the binder
                 necessary to obtain mechanical performance suitable for
                 the 3480 tape drive. A high modulus and a relatively
                 high glass-transition temperature were found to be
                 required to avoid changes in the frictional properties
                 of the tape.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording)",
  classification = "539; 543; 704; 721; 722",
  corpsource =   "IBM General Products Div., Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3480 tape drive; chemical properties; chromium
                 compounds; chromium compounds --- Physical Properties;
                 chromium dioxide; coating techniques; CrO$_2$; data
                 storage, magnetic; design; flexible magnetic; flexible
                 magnetic tape; hydrolytic degradation; IBM 3480
                 Magnetic Tape; magnetic tapes; magnetic-recording tape;
                 measurement; mechanical properties; performance;
                 polyester-polyurethane binders; Subsystem; Tape; tape
                 drive",
  subject =      "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
                 C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS",
  treatment =    "N New Development; P Practical; X Experimental",
}

@Article{Anonymous:1986:RPI,
  author =       "Anonymous",
  title =        "Recent papers by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "217--226",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:58:06 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1986:RIP,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "2",
  pages =        "227--228",
  month =        mar,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:27:11 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Easton:1986:KDS,
  author =       "Malcolm C. Easton",
  title =        "Key-Sequence Data Sets on Indelible Storage",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "230--241",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Methods for creating and maintaining key-sequence data
                 sets without overwriting the storage medium are
                 described. These methods may be applied to erasable or
                 to write-once storage devices, and they are compatible
                 with conventional device error-management techniques.
                 All past values of data records are preserved in a data
                 structure called a Write-Once B-Tree. Rapid random
                 access is available to records by key value; rapid
                 sequential access is available to records in
                 key-sequence order. Queries requesting data as of a
                 previous time are processed as rapidly as requests for
                 current data. Access time is proportional to the
                 logarithm of the number of current records in the
                 database. Efficient methods for inserting, updating,
                 and deleting records are described. Upper bounds for
                 tree depth and for storage consumption are given and
                 compared with results from simulation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6160 (Database management
                 systems (DBMS))",
  classification = "721; 722; 723",
  corpsource =   "Res. Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "access time; bounds for tree depth; data processing;
                 data sets; data storage, digital; data structure; data
                 structures; database management systems; database
                 systems; DBMS; deleting; design; devices; erasable
                 storage; error-management; indelible databases;
                 indelible storage; key-sequence data; key-sequence data
                 sets; key-sequence order; KSDS; magnetic disc; magnetic
                 disc storage; maintenance; management; measurement;
                 optical disc storage; overwriting avoidance;
                 performance; Performance; rapid; rapid random access;
                 records; records insertion; sequential access; sets;
                 storage; storage consumption; techniques; tree depth;
                 updating; Write-Once B-Tree; write-once b-tree;
                 write-once storage devices",
  subject =      "H.2.m Information Systems, DATABASE MANAGEMENT,
                 Miscellaneous \\ E.4 Data, CODING AND INFORMATION
                 THEORY, Data compaction and compression",
  treatment =    "G General Review",
}

@Article{Stone:1986:ACD,
  author =       "Harold S. Stone and Paolo Sipala",
  title =        "The average complexity of depth-first search with
                 backtracking and cutoff",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "242--258",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "636.68041",
  abstract =     "This paper analyzes two algorithms for depth-first
                 search of binary trees. The first algorithm uses a
                 search strategy that terminates the search when a
                 successful leaf is reached. The algorithm does not use
                 internal cutoff to restrict the search space. If N is
                 the depth of the tree, then the average number of nodes
                 visited by the algorithm is as low as O(N) and as high
                 as O(2**N) depending only on the value of the
                 probability parameter that characterizes the search.
                 The second search algorithm uses backtracking with
                 cutoff. A decision to cut off the search at a node
                 eliminates the entire subtree below that node from
                 further consideration. The result for this algorithm is
                 that the average number of nodes visited grows linearly
                 in the depth of the tree, regardless of the cutoff
                 probability. If the cutoff probability is high, the
                 search has a high probability of failing without
                 examining much of the tree. If the cutoff probability
                 is low, the search has a high probability of succeeding
                 on the leftmost path of the tree without performing
                 extensive backtracking.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1160 (Combinatorial mathematics); C4240 (Programming
                 and algorithm theory)",
  classification = "723; 921; 922",
  corpsource =   "Div. of Res., IBM Thomas J. Watson Res. Center,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(mathematics); algorithm theory; algorithms;
                 Algorithms; algorithms; average complexity; average
                 number; backtracking; binary trees; computational
                 complexity; computer programming; cutoff; cutoff
                 probability; depth-first search; mathematical
                 techniques --- Trees; NP-complete problems; of nodes
                 visited; probability; search algorithm; search
                 algorithms; theory; trees",
  subject =      "I.2.8 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Problem Solving, Control Methods, and
                 Search, Graph and tree search strategies \\ I.2.8
                 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
                 Problem Solving, Control Methods, and Search,
                 Backtracking \\ F.2.2 Theory of Computation, ANALYSIS
                 OF ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
                 Algorithms and Problems, Sorting and searching",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Patel:1986:FDM,
  author =       "Arvind M. Patel",
  title =        "On-The-Fly Decoder for Multiple Byte Errors",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "259--268",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Multiple-error-correcting Reed--Solomon on BCH codes
                 in GF(2**b) can be used for correction of multiple
                 burst errors in binary data. However, the relatively
                 long time required for decoding multiple errors has
                 been among the main objections to applying these
                 schemes to high-performance computer products. A
                 decoding procedure is developed for on-the-fly
                 correction of multiple symbol (byte) errors in
                 Reed--Solomon or BCH codes. A new decoder architecture
                 expands the concept of Chien search for error locations
                 into computation of error values as well, and creates a
                 synchronous procedure for complete on-the-fly error
                 correction of multiple byte errors. Forney's expression
                 for error values is simplified, which results in
                 economies in hardware and decoding time. All division
                 operations are eliminated from the computation of the
                 error-locator equation, and only one division operation
                 is required in the computation of error values. The
                 special cases of fewer errors are processed
                 automatically, using the corresponding smaller set of
                 syndromes through a single set of hardware. The
                 resultant decoder implementation is suited for LSI chip
                 design with pipelined data flow.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C5320K
                 (Optical storage)",
  classification = "713; 714; 722; 723",
  corpsource =   "Gen. Products Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "BCH codes; binary data; byte errors; Chien search;
                 codes, symbolic; complete on-the-fly error correction
                 of multiple; computation of error values; computer
                 metatheory; correction of multiple burst errors in;
                 decoder architecture; decoder for; decoding; decoding
                 time reduction; design; Error Correction; error
                 correction codes; example; Forney's expression for
                 error values; hardware reduction; integrated circuits,
                 LSI --- Computer Aided Design; LSI chip design;
                 magnetic disc storage; magnetic tape storage; multiple
                 burst errors; multiple byte errors; multiple error
                 correcting codes; of error locations; optical disc
                 storage; performance; pipelined data flow; procedure;
                 Reed Solomon codes; Reed--Solomon codes; set of
                 syndromes; single set of hardware; smaller;
                 synchronous; theory; verification",
  subject =      "E.4 Data, CODING AND INFORMATION THEORY, Data
                 compaction and compression \\ B.5.m Hardware,
                 REGISTER-TRANSFER-LEVEL IMPLEMENTATION, Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
  xxauthor =     "Arvind M. Patele",
  xxpages =      "259--269",
}

@Article{Cannon:1986:DPM,
  author =       "D. M. Cannon and W. R. Dempwolf and J. M. Schmalhorst
                 and F. B. Shelledy and R. D. Silkensen",
  title =        "Design and Performance of a Magnetic Head for a
                 High-Density Tape Drive",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "270--277",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The design of a magnetic head for use in the tape
                 drive portion of the IBM 3480 Magnetic Tape Subsystem
                 required that advances be made in track density and
                 linear recording density while meeting requirements for
                 signal quality, manufacturability, and reliability. The
                 design that was developed to fulfill these needs
                 combines ferrite pole-pieces, magnetorestrictive read
                 elements, and planar-deposited write turns. This paper
                 describes the read and write elements of the head and
                 the approach used in the selection of the design
                 parameters.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170C (Project and design engineering); B3120B
                 (Magnetic recording); C5320C (Storage on moving
                 magnetic media)",
  classification = "704; 708; 721; 722",
  corpsource =   "Gen. Products. Div., IBM, Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "data storage, magnetic; density; deposited write
                 turns; design; design engineering; design parameters;
                 design tradeoffs; ferrite devices; ferrite pole-pieces;
                 half-inch tape; head; high-density tape drive; IBM
                 3480; linear recording; magnetic; magnetic head;
                 magnetic heads; magnetic tape equipment; magnetic tape
                 subsystem; magnetoresistive read elements;
                 manufacturability; measurement; performance; planar-;
                 read and write elements; recording density;
                 reliability; signal quality; Tape; tape drive portion;
                 track density; write elements",
  subject =      "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
                 Input/Output Devices \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS",
  treatment =    "P Practical; R Product Review; T Theoretical or
                 Mathematical; X Experimental",
}

@Article{Prisgrove:1986:SSP,
  author =       "Lindsay A. Prisgrove and Gerald S. Shedler",
  title =        "Symmetric stochastic {Petri} nets",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "278--293",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68Q90 (68U20)",
  MRnumber =     "844 913",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "636.68066",
  abstract =     "The stochastic Petri net (SPN) model is suited to
                 formal representation of concurrency, synchronization,
                 and communication. We focus on discrete event
                 simulation methods for SPN models with special
                 structure and define a symmetric SPN. Exploiting
                 properties of a symmetric SPN and underlying
                 regenerative process structure, we establish steady
                 state estimation procedures based on independent,
                 nonidentically distributed blocks of the marketing
                 process. We also establish estimation procedures for
                 passage times in the symmetric SPN setting. These
                 results lead to efficient estimation procedures for
                 delay\slash throughput characteristics of ring networks
                 with identical ports.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); C1160
                 (Combinatorial mathematics)",
  classification = "722; 723; 922",
  corpsource =   "Dept. of Oper. Res., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer metatheory; computer systems, digital; delay
                 characteristics; directed graphs; discrete event;
                 discrete event simulation; Distributed; distributed
                 processing; estimation procedures; estimation
                 procedures for passage; identical ports; methods;
                 passage times; Petri nets; ports; regenerative process
                 structure; ring networks; ring networks with identical;
                 SPN; statistical methods; steady state; symmetrical
                 stochastic Petri nets; theory; throughput
                 characteristics; times; verification",
  subject =      "F.1.1 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Models of Computation, Unbounded-action
                 devices \\ I.6.m Computing Methodologies, SIMULATION
                 AND MODELING, Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Arbab:1986:CCA,
  author =       "Bijan Arbab",
  title =        "Compiling circular attribute grammars into {Prolog}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "294--309",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an algorithm for compiling
                 attribute grammars into Prolog. The attribute grammars
                 may include inherited and synthesized attributes and
                 contain recursive (circular) definitions. The semantics
                 of the recursive definitions is defined in terms of a
                 fixed-point finding function. The generation Prolog
                 code stands in direct relation to its attribute
                 grammar, where logical variables play the role of
                 synthesized or inherited attributes. Thus an effective
                 method for the execution of recursive attribute
                 grammars has been defined and applied.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "721; 723",
  corpsource =   "IBM Sci. Center, Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; algorithms; attribute grammars; attribute
                 grammars into Prolog; automata theory; circular
                 attribute grammars; compiling; computer metatheory;
                 computer programming languages; definitions; design;
                 execution of recursive attribute; fixed-point finding
                 function; Grammars; grammars; inherited attributes;
                 languages; program compilers; Prolog; PROLOG; Prolog
                 code; recursive; semantics; synthesized or inherited
                 attributes",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, Prolog \\ F.4.2 Theory of Computation,
                 MATHEMATICAL LOGIC AND FORMAL LANGUAGES, Grammars and
                 Other Rewriting Systems, Grammar types \\ D.3.4
                 Software, PROGRAMMING LANGUAGES, Processors,
                 Compilers",
  treatment =    "P Practical",
}

@Article{Cioffi:1986:LSI,
  author =       "J. M. Cioffi",
  title =        "Least-Squares Storage-Channel Identification",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "310--320",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Pulse (dibit) and step (transition) responses for
                 magnetic-storage channels are important for
                 detection-circuitry design and for comparison of
                 various media, heads, and other channel components.
                 This paper presents a least-squares procedure that can
                 be used to identify the dibit and transition responses
                 from measurements of the read-head response to any
                 known data sequence written on the medium. The method
                 yields higher-quality estimates for the dibit and step
                 shapes than does determining these same characteristics
                 by measuring the average response to isolated
                 transition or by performing a Discrete Fourier
                 Transform (DFT) on the response to a pseudorandom data
                 pattern. The new method can be implemented off line but
                 also can be made sufficiently efficient to be
                 implemented with a microprocessor for use in
                 self-optimizing (adaptive) channel detection
                 circuitry.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1220 (Simulation, modelling and identification);
                 C4130 (Interpolation and function approximation);
                 C5320C (Storage on moving magnetic media)",
  classification = "721; 722; 723; 921",
  corpsource =   "Dept. of Electr. Eng., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "channel detection circuitry; circuitry design; data
                 sequence; data storage channels; data storage,
                 magnetic; design; detection-; dibit response; disc;
                 identification; least squares approximations; least
                 squares storage channel; least-squares procedure;
                 magnetic disc; magnetic tape storage; magnetic-storage
                 channels; mathematical techniques --- Least Squares
                 Approximations; measurement; Performance; pulse
                 response; read-head response; responses; self
                 optimising channel detection circuitry; step response;
                 storage; storage-channel identification; tape storage;
                 theory; transition",
  subject =      "G.3 Mathematics of Computing, PROBABILITY AND
                 STATISTICS \\ B.4.2 Hardware, INPUT/OUTPUT AND DATA
                 COMMUNICATIONS, Input/Output Devices, Channels and
                 controllers \\ B.3.m Hardware, MEMORY STRUCTURES,
                 Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Barbosa:1986:MSW,
  author =       "Lineu C. Barbosa",
  title =        "A maximum-energy-concentration spectral window",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "321--325",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A time-discrete solution method is proposed for
                 realization of a spectral window which is ideal from an
                 energy concentration viewpoint. This window is one that
                 concentrates the maximum amount of energy in a
                 specified bandwidth and hence provides optimal spectral
                 resolution.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140 (Signal processing and detection); C1260
                 (Information theory)",
  classification = "713; 716; 717; 718",
  corpsource =   "Res. Div., IBM, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "design; electric filters, digital; filtering and
                 prediction theory; maximum-energy-concentration;
                 maximum-energy-concentration spectral window; optimal
                 spectral resolution; signal filtering and prediction;
                 solution method; spectral window; Spectrum Analysis;
                 theory; time-discrete",
  subject =      "E.4 Data, CODING AND INFORMATION THEORY, Data
                 compaction and compression",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Stapper:1986:YFD,
  author =       "C. H. Stapper",
  title =        "On Yield, Fault Distributions, and Clustering of
                 Particles",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "3",
  pages =        "326--338",
  month =        may,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Increasing the levels of semiconductor integration to
                 larger chips with more transistors causes the fault and
                 defect distributions of VLSI memory chips to deviate
                 increasingly further from simple random Poisson
                 statistics. The spatial distributions of particles on
                 semiconductor wafers have been analyzed to gain insight
                 into the nature of integrated circuit defect
                 statistics. The analysis was done using grids of
                 squares known as quadrats. It was found that the
                 cluster parameter, which until now has been treated as
                 a constant, did vary with quadrat area. The results
                 also show that the deviation from Poisson statistics
                 continues to increase into the realm of wafer-scale
                 integration or WSI. Computer simulations verify this
                 effect.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits)",
  classification = "421; 713; 714; 922",
  corpsource =   "Gen. Technol. Div., IBM, Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cluster; clustering; computer simulations; defect
                 distributions; defect statistics; design; deviation
                 from Poisson statistics; Failure; fault distributions;
                 grids of squares; integrated circuit; integrated
                 circuit technology; integrated circuits, VLSI;
                 integrated memory circuits; measurement; memory chips;
                 of particles; parameter; performance; probability;
                 quadrat area; quadrats; semiconductor wafers; spatial
                 distributions of particles; statistical methods;
                 theory; VLSI; VLSI memory chips; wafer-scale
                 integration; WSI; yield",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ B.7.1 Hardware, INTEGRATED CIRCUITS, Types
                 and Design Styles, Advanced technologies \\ B.7.3
                 Hardware, INTEGRATED CIRCUITS, Reliability and
                 Testing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Anonymous:1986:STM,
  author =       "Anonymous",
  title =        "Scanning Tunneling Microscopy Workshop",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "355--430",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Nov 10 07:52:46 1998",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Proceedings includes ten papers dealing with the
                 performance applications and features of the scanning
                 tunnel microscope (STM). This instrument is capable of
                 measuring the positions of individual surface atoms
                 with unprecedented three-dimensional resolution. It has
                 been used to measure vertical position differences as
                 small as 0.1A and a lateral resolution that is better
                 than 2A. Topics discussed include: biological
                 materials, metallic surfaces, spectroscopic analysis,
                 and electronic and atomic properties.",
  abstract-2 =   "Presented here is an overview of the present status
                 and future prospects of scanning tunneling microscopy.
                 Topics covered include the physical basis of the
                 scanning tunneling microscope, its instrumentation
                 aspects, and its use for structural and spectroscopic
                 imaging --- on a scale which extends to atomic
                 dimensions. Associated experimental and theoretical
                 studies are reviewed, including several which suggest
                 potential applicability of this new type of microscope
                 to a relatively broad range of biological, chemical,
                 and technological areas.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rueschlikon, Switz",
  affiliationaddress = "IBM, Rueschlikon, Switz",
  classcodes =   "A0130R (Reviews and tutorial papers; resource
                 letters); A0630C (Spatial variables measurement); A0780
                 (Electron and ion microscopes and techniques)",
  classification = "531; 714; 741; 801; 933; 941",
  conference =   "Scanning Tunneling Microscopy Workshop, Oberlech",
  corpsource =   "Zurich Res. Lab., IBM Corp., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; aspects; atom transfer; atomic
                 dimensions; design; future prospects; imaging
                 techniques; instrumentation; measurement; metals and
                 alloys; microscopes; overview; present status; reviews;
                 scanning tunneling microscopy; scanning tunnelling
                 microscopy; semiconductor devices; semiconductor
                 materials; spectroscopic analysis; spectroscopic
                 analysis --- Imaging Techniques; spectroscopic imaging;
                 STM; structural imaging; surface science; surface
                 topography; surface topography measurement",
  meetingaddress = "Oberlech, Austria",
  meetingdate =  "Jul 1985",
  sponsor =      "IBM Europe Inst",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering",
  treatment =    "B Bibliography; G General Review",
}

@Article{Hansma:1986:STJ,
  author =       "P. K. Hansma",
  title =        "Squeezable Tunneling Junctions",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "370--373",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Squeezable tunneling junctions establish the current
                 state of the art for resistance stability of
                 mechanically adjustable tunneling structures at DELTA
                 R/R approximately equals 0.1\%. This is sufficient for
                 use in connection with spectroscopies as subtle as
                 phonon spectroscopy, but it is marginal and cannot at
                 present be maintained to high enough bias voltage to
                 permit molecular vibrational spectroscopy. Squeezable
                 junctions have been used for characterizing bulk
                 samples and for differential capacitance-voltage
                 analyses of semiconductors.",
  acknowledgement = ack-nhfb,
  affiliation =  "Univ of California, Santa Barbara, CA, USA",
  affiliationaddress = "Univ of California, Santa Barbara, CA, USA",
  classcodes =   "A0620H (Measurement standards and calibration); A0750
                 (Electrical instruments and techniques); A0780
                 (Electron and ion microscopes and techniques); A7340G
                 (Tunnelling: general)A7450 (Proximity effects,
                 tunnelling phenomena, and Josephson effect)",
  classification = "701; 714",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "Dept. of Phys., California Univ., Santa Barbara, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bias voltage; bulk sample; capacitance measurement;
                 characterisation; design; differential
                 capacitance-voltage analyses; electron microscopy;
                 Junctions; measurement; mechanically adjustable
                 tunneling structures; molecular vibrational
                 spectroscopy; phonon spectroscopy; resistance;
                 resistance stability; semiconductor diodes, tunnel;
                 semiconductors; spectroscopy; squeezable tunneling
                 junctions; squeezable tunnelling junctions; stability;
                 standards; superconducting energy gap; superconductive
                 tunnelling; tunnelling",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering",
  treatment =    "A Application",
}

@Article{Lang:1986:EST,
  author =       "Norton D. Lang",
  title =        "Electronic Structure and Tunneling Current for
                 Chemisorbed Atoms",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "374--379",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We discuss the tunneling current density in the vacuum
                 region between two planar metal electrodes, one of
                 which has an atom chemisorbed on its surface. The
                 relation of this current distribution to the electronic
                 structure of the adatom is analyzed. The study of this
                 model leads to a better understanding of important
                 aspects of the current flow in the scanning tunneling
                 microscope. The emphasis is not so much on the question
                 of resolution discussed in other theoretical studies as
                 on the characteristic signatures of chemically
                 different atoms.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A6845B (Sorption equilibrium); A7320H (Impurity and
                 defect levels; energy levels of adsorbed species);
                 A7340J (Metal-to-metal contacts)",
  classification = "704; 712; 714",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adatom; adsorbed layers; chemisorbed atoms;
                 chemisorption; current density; current distribution;
                 design; electrodes; electron states; electronic
                 structure; planar metal; planar metal electrodes;
                 scanning tunneling microscope; semiconductor devices;
                 semiconductor materials --- Electronic Properties;
                 surface; Tunneling; tunneling current; tunnelling",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Baro:1986:ABT,
  author =       "A. M. Baro and R. Miranda and J. L. Carrascosa",
  title =        "Application to Biology and Technology of the Scanning
                 Tunneling Microscope Operated in Air at Ambient
                 Pressure",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "380--386",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have investigated the operation of the scanning
                 tunneling microscope (STM) in air at atmospheric
                 pressure, thus permitting the imaging of samples
                 without the need for subjecting them to a vacuum
                 environment. This may be of practical important for
                 many types of samples having biological and
                 technological interest. Imaging of biological samples
                 has been found to be possible after deposition onto a
                 flat structureless conducting substrate (highly
                 oriented pyrolytic graphite). Three-dimensional
                 profiles of structures derived from the virus
                 designated as bacteriophage phi 29 could thus be
                 obtained. Other profiles have been obtained which
                 indicate applicability to surfaces of technological
                 interest: for example, in the measurement of the
                 surface roughness of industrial components with
                 increased precision, suggesting use of the STM as a new
                 standard instrument for that purpose.",
  acknowledgement = ack-nhfb,
  affiliation =  "Autonomous Univ of Madrid, Madrid, Spain",
  affiliationaddress = "Autonomous Univ of Madrid, Madrid, Spain",
  classcodes =   "A0630C (Spatial variables measurement); A0780
                 (Electron and ion microscopes and techniques); A6116D
                 (Electron microscopy determinations); A8780
                 (Biophysical instrumentation and techniques)",
  classification = "461; 741; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "Dept. of Fundamental Phys., Autonomous Univ. of
                 Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3D profiles; ambient pressure; atmospheric pressure;
                 bacteriophage; biological materials; biological
                 samples; biological techniques and instruments;
                 biology; components; design; highly oriented; human
                 factors; imaging; industrial; Microscopic Examination;
                 microscopy; pyrolytic graphite; scanning tunneling
                 microscope; scanning tunnelling; structureless
                 conducting substrate; surface roughness measurement;
                 surface topography measurement; virus",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Engineering \\ J.3 Computer Applications,
                 LIFE AND MEDICAL SCIENCES, Biology \\ I.4.9 Computing
                 Methodologies, IMAGE PROCESSING, Applications",
  treatment =    "A Application",
}

@Article{Elrod:1986:TM,
  author =       "S. A. Elrod and A. Bryant and A. L. {de Lozanne} and
                 S. Park and D. Smith and C. F. Quate",
  title =        "Tunneling microscopy from 300 to {4.2K}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "387--395",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A scanning tunneling microscope (STM) has been
                 developed for operation over the full temperature range
                 from 300 to 4.2 K. At room temperature, the instrument
                 has been used to produce topographic images of grain
                 structure in a copper-titanium alloy foil and of atomic
                 structure on a Pt(100) surface. At low temperatures,
                 the instrument can be used in a new spectroscopic mode,
                 one which combines the high spatial resolution of the
                 STM with the existing technique of electron tunneling
                 spectroscopy. This new capability has been demonstrated
                 by using the microscope to probe spatial variations in
                 the superconducting character of a niobium-tin alloy
                 film.",
  acknowledgement = ack-nhfb,
  affiliation =  "Xerox Corp, Palo Alto, CA, USA",
  affiliationaddress = "Xerox Corp, Palo Alto, CA, USA",
  classcodes =   "A0630C (Spatial variables measurement); A0780
                 (Electron and ion microscopes and techniques); A6116D
                 (Electron microscopy determinations); A7470
                 (Superconducting materials)",
  classification = "542; 544; 546; 549; 731; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "Xerox Corp., Palo Alto Res. Centre, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(100) surface; 4.2 to 300K; atomic structure;
                 character; copper titanium alloys; Cu-Ti alloy foil;
                 electron tunneling spectroscopy; grain structure;
                 Microscopic Examination; Nb-Sn alloy film; niobium
                 alloys; niobium tin alloys --- Microscopic Examination;
                 Pt; scanning tunneling microscope; scanning tunnelling
                 microscopy; spatial resolution; spatial variations;
                 spectroscopic analysis; spectroscopic mode;
                 superconducting; surface; temperature range; tin
                 alloys; topographic images; topography measurement;
                 type II superconductors",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "K.0 Computing Milieux, GENERAL",
  treatment =    "A Application; X Experimental",
  xxtitle =      "Tunneling Microscopy from 300 to 4.2 {K}",
}

@Article{Demuth:1986:STM,
  author =       "J. E. Demuth and R. J. Hamers and R. M. Tromp and M.
                 E. Welland",
  title =        "A Scanning Tunneling Microscope for Surface Science
                 Studies",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "396--402",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new design is described for a scanning tunneling
                 microscope intended for surface science studies. The
                 performance of the microscope is evaluated from
                 tunneling images obtained of the Si(111)7 multiplied by
                 7 surface. Periodic structures, point defects, and
                 grain boundary structures are observed with
                 atomic-scale resolution and are discussed.
                 Illustrations of various types of image processing and
                 data display are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Research Div, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Research Div, Yorktown Heights, NY, USA",
  classcodes =   "A0630C (Spatial variables measurement); A0780
                 (Electron and ion microscopes and techniques); A6116D
                 (Electron microscopy determinations); A6820 (Solid
                 surface structure)",
  classification = "549; 741; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "IBM Res. Div. Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "atomic-; data display; design; elemental
                 semiconductors; grain boundary; grain boundary
                 structures; image processing; images; periodic
                 structure; point defects; scale resolution; scanning
                 tunneling microscope; scanning tunnelling microscopy;
                 semiconductor; Si; silicon; silicon and alloys; surface
                 (111)7*7; surface science; surface science studies;
                 surface structure; surface topography measurement;
                 Surfaces; tunneling",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Physics \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Engineering",
  treatment =    "A Application; X Experimental",
}

@Article{Hosler:1986:DPS,
  author =       "W. Hosler and R. J. Behm and E. Ritter",
  title =        "Defects on the {Pt(100)} surface and their influence
                 on surface reactions --- a scanning tunneling
                 microscopy study",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "403--410",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A6820 (Solid surface structure); A8265J (Heterogeneous
                 catalysis at surfaces and other surface reactions)",
  corpsource =   "Inst. for Crystallography, Munich Univ., West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(100) surface; catalysts; catalytic activity; chemical
                 irregularities; decomposition; defect structure;
                 electron microscope examination of materials; ethylene;
                 irregularities; mass; phase transition; platinum; Pt;
                 scanning tunneling microscopy; structural; surface
                 chemistry; surface reactions; surface roughening;
                 surface step sites; surface structure; terrace edges;
                 thermal; transport; tunnelling",
  treatment =    "X Experimental",
}

@Article{Kaiser:1986:SES,
  author =       "W. J. Kaiser and R. C. Jaklevic",
  title =        "Spectroscopy of Electronic States of Metals with a
                 Scanning Tunneling Microscope",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "411--416",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have constructed a scanning tunneling microscope
                 (STM) and have obtained current-voltage derivative
                 spectra from metal surfaces. For Au(111) we have
                 observed an electronic surface state 0.4 eV below the
                 Fermi energy. This state has previously been observed
                 with photoemission and oxide tunneling experiments. We
                 have also observed strong peaks in spectra obtained
                 from Pd(111) which we identify with surface states and
                 effects derived from bulk energy bands. In the voltage
                 range investigated, tunneling takes place through the
                 entire vacuum gap between the metallic tip of the
                 microscope and the surface of the sample being
                 examined. The STM spectroscopy results are compared
                 with previous experimental work and theory. These
                 intrinsic surface states are claimed to be the first
                 which have been observed with the STM and demonstrate
                 its applicability to the investigation of surface
                 electronic structure.",
  acknowledgement = ack-nhfb,
  affiliation =  "Ford Motor Co, Dearborn, MI, USA",
  affiliationaddress = "Ford Motor Co, Dearborn, MI, USA",
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A7320 (Electronic surface states)",
  classification = "531; 547; 741; 801; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "Dept. of Phys., Ford Motor Co., Dearborn, MI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Au; bulk; bulk energy bands; current-voltage
                 derivative; current-voltage derivative spectra; design;
                 electron states; electronic surface state; energy
                 bands; gold; gold and alloys --- Microscopic
                 Examination; intrinsic surface states; measurement;
                 metal surfaces; metals and alloys; palladium; palladium
                 and alloys; Pd; scanning tunneling microscope; scanning
                 tunnelling microscopy; spectra; Spectroscopic Analysis;
                 surface; surface (111); surface electronic state
                 spectroscopy; vacuum gap",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  treatment =    "A Application; X Experimental",
}

@Article{Pohl:1986:SDC,
  author =       "Dieter W. Pohl",
  title =        "Some Design Criteria in Scanning Tunneling
                 Microscopy",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "417--427",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Optimum functioning of a scanning tunneling microscope
                 (STM) requires tip-to-sample position control with
                 picometer precision, a rough and fine positioning
                 capability in three dimensions, a scanning range of at
                 least 100 times the lateral resolution, a scanning
                 speed as high as possible, and simplicity of operation.
                 These requirements have to be satisfied in the presence
                 of building vibrations with up to micrometer-size
                 amplitudes, temperature drift, and other perturbations.
                 They result in design rules discussed for the
                 optimization of damping, stiffness, electrical control
                 circuitry, and the performance of the piezoelectric
                 actuators usually employed in STMs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rueschlikon, Switz",
  affiliationaddress = "IBM, Rueschlikon, Switz",
  classcodes =   "A0780 (Electron and ion microscopes and techniques)",
  classification = "714; 732; 741; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "Zurich Res. Lab., IBM Corp., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "actuators; Applications; building vibrations; damping;
                 design; design criteria; design engineering; drift;
                 electrical control circuitry; lateral; microscopes;
                 microscopy; optimum functioning; picometer; picometer
                 precision; piezoelectric actuators; piezoelectric
                 devices; position control; positioning capability;
                 precision; resolution; scanning; scanning range;
                 scanning speed; scanning tunneling; scanning tunneling
                 microscopy; stiffness; temperature; tip-to-sample
                 position control; tunnelling microscopy",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Gomer:1986:PMA,
  author =       "Robert Gomer",
  title =        "Possible Mechanisms of Atom Transfer in Scanning
                 Tunneling Microscopy",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "4",
  pages =        "428--430",
  month =        jul,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Various mechanisms for the sudden transfer of an atom
                 from or to the tip of a scanning tunneling microscope
                 are considered. It is concluded that thermal desorption
                 could be responsible and also that quasi-contact in
                 which the adsorbed atom is in effect `touching' both
                 surfaces, which would still be separated from each
                 other by 2-4 A, can lead to unactivated transfer via
                 tunneling. For barrier widths as small as 0.5 A,
                 however, tunneling becomes negligible.",
  acknowledgement = ack-nhfb,
  affiliation =  "Univ of Chicago, Chicago, IL, USA",
  affiliationaddress = "Univ of Chicago, Chicago, IL, USA",
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); A6845D
                 (Evaporation and condensation; adsorption and
                 desorption kinetics); A7970 (Field emission and field
                 ionization)",
  classification = "741; 933; 941",
  conference =   "Scanning Tunneling Microsc Workshop, Oberlech",
  corpsource =   "James Franck Inst., Chicago Univ., IL, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adsorbed atom; atom transfer; barrier widths; design;
                 desorption; field evaporation; microscopes; microscopy;
                 Physical Properties; quasicontact; scanning tunneling
                 microscopy; scanning tunnelling; thermal desorption;
                 unactivated transfer",
  meetingaddress = "Austria",
  meetingdate =  "Jul 1985",
  meetingdate2 = "07/85",
  subject =      "I.4.9 Computing Methodologies, IMAGE PROCESSING,
                 Applications \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Engineering \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Muralt:1986:WLB,
  author =       "P. Muralt and D. W. Pohl and W. Denk",
  title =        "Wide-Range, Low-Operating-Voltage, Bimorph {STM}:
                 Application as Potentiometer",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "443--450",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An STM is described which operates at voltages less
                 than equivalent to 120 v. Its 3D scanner offers a wide
                 range of displacements, has low drift and hysteresis,
                 and exhibits good resolution. These features make it
                 interesting for technical applications. Its use as a
                 potentiometer is described.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); B2390
                 (Electron and ion microscopes); B2860 (Piezoelectric
                 and ferroelectric devices); B7310B (Voltage); C3120C
                 (Spatial variables)",
  classification = "741; 941; 942",
  corpsource =   "Inst. for Atomic and Solid State Phys., Freie Univ.,
                 Berlin, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0 to 120 V; 3D; 3D scanner; bender STM; bimorph;
                 design; features; low drift; low-operating-voltage;
                 microscopes; Performance; piezoelectric transducers;
                 position control; potentiometer; potentiometer
                 instruments; range of displacements; resolution;
                 scanner; scanning; scanning tunneling microscopy;
                 scanning tunneling microscopy (STM); STM; tunnelling
                 microscopy; voltage measurement; wide-range",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Buttiker:1986:TTT,
  author =       "M. Buttiker and R. Landauer",
  title =        "Traversal time for tunneling",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "451--454",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340G (Tunnelling: general); B2530 (Semiconductor
                 junctions and interfaces)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; probability; reflection; theory; transmission
                 probability; traversal time; tunneling phenomena;
                 tunnelling; tunnelling of carriers",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies",
  treatment =    "X Experimental",
}

@Article{Coombs:1986:PVT,
  author =       "J. H. Coombs and J. B. Pethica",
  title =        "Properties of Vacuum Tunneling Currents: Anomalous
                 Barrier Heights",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "455--459",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A design of STM which does not use vacuum internal
                 vibration isolation and may be cooled to liquid helium
                 temperatures is described. Tunneling current
                 characteristics underlying STM operations are
                 discussed. A model is presented to explain the
                 anomalously low (less than 1 eV) tunneling barrier
                 heights often observed. On the basis of this model we
                 suggest criteria for obtaining reliable STM images.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A7340G (Tunnelling: general)",
  classification = "714; 741; 931; 933; 941",
  corpsource =   "Cavendish Lab., Cambridge Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "anomalous barrier heights; barrier heights; criteria
                 for obtaining reliable STM images; design; liquid He
                 temperatures; liquid helium temperatures; measurement;
                 microscopes; model; scanning tunneling microscope;
                 scanning tunnelling microscopy; semiconductor devices;
                 STM; Tunneling; vacuum tunneling currents",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Fink:1986:MTS,
  author =       "Hans-Werner Fink",
  title =        "Mono-Atomic Tips for Scanning Tunneling Microscopy",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "460--465",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "By field-ion microscopy techniques, we have been able
                 to create stable tips whose very ends are made up of
                 just one individual atom, deposited from the gas phase
                 onto an upper terrace of a pyramidal (111)-oriented
                 tungsten tip. The first three layers of the tip consist
                 of one, three, and seven atoms, respectively.
                 Consequences of these observations for the
                 understanding of energy transfer between gas-phase
                 atoms and a solid surface are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); A6116F
                 (Field-ion microscopy determinations; atom and ion
                 scattering techniques); B2390 (Electron and ion
                 microscopes)",
  classification = "543; 715; 741; 931; 933; 941",
  corpsource =   "IBM Zurich Res. Labs., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "design; Field Emission; field emission ion microscopy;
                 field-ion microscopy; FIM; gas-phase atoms;
                 microscopes; microscopy; mono atomic tips; mono-atomic
                 tips; physics --- Atomic; pyramidal tip; scanning
                 tunneling microscopy; scanning tunnelling; single atom
                 tips; stable tips; STM; techniques; tungsten; tungsten
                 and alloys --- Microscopic Examination; tungsten tip;
                 VPE; W tip",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies",
  treatment =    "G General Review; X Experimental",
}

@Article{Feenstra:1986:STM,
  author =       "R. M. Feenstra and A. P. Fein",
  title =        "Scanning Tunneling Microscopy of Cleaved Semiconductor
                 Surfaces",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "466--471",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Scanning tunneling microscopy is used to study the
                 surface topography of cleaved GaAs(110) and Si(111)
                 surfaces. For GaAs we observe 1 multiplied by 1
                 periodicity, with a left bracket 001 right bracket
                 corrugation amplitude of typically 0.2 A and a left
                 bracket 1 OVER BAR 10 right bracket corrugation
                 amplitude of approx. 0.05 A. Surface point defects are
                 observed, consisting typically of approx. 0.7-A-deep
                 depressions extending along the rows. For Si(111), we
                 find a periodicity of two unit cells, indicating the
                 presence of the 2 multiplied by 1 reconstruction. We
                 observe a maximum left bracket 21 OVER BAR 1 OVER BAR
                 right bracket corrugation amplitude of 0.5 A and a left
                 bracket 01 OVER BAR 1 right bracket corrugation
                 amplitude of less than 0.02 A, consistent with the pi
                 -bonded chain model for this surface. Structural
                 disorder on the surface most commonly appears as
                 `protrusions' along or crossing over between the
                 chains. Orientational disorder is observed in the tilt
                 of the chains.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0630C (Spatial variables measurement); A6116D
                 (Electron microscopy determinations); A6170 (Defects in
                 crystals); B2390 (Electron and ion microscopes); B2520C
                 (Elemental semiconductors); B2520D (II-VI and III-V
                 semiconductors); B2550 (Semiconductor device
                 technology); B7320C (Spatial variables)",
  classification = "547; 549; 712; 741; 941",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "amplitude; chain model; cleaved; cleaved semiconductor
                 surfaces; corrugation; corrugation amplitude; crystal
                 defects; depressions; design; elemental semiconductors;
                 GaAs; gallium arsenide; III-V semiconductors;
                 measurement; Microscopic Examination; orientational
                 disorder; periodicity; protrusions; scanning tunneling
                 microscopy; scanning tunnelling microscopy;
                 semiconducting gallium arsenide; semiconducting silicon
                 --- Microscopic Examination; semiconductor devices ---
                 Defects; semiconductor surfaces; semiconductor
                 technology; semiconductors; Si; silicon; STM; surface
                 point defects; surface topography",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Gimzewski:1986:STM,
  author =       "J. K. Gimzewski and A. Humbert",
  title =        "Scanning Tunneling Microscopy of Surface
                 Microstructure on Rough Surfaces",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "472--477",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An important feature of the scanning tunneling
                 microscope (STM) is its ability to image nonperiodic or
                 disordered surfaces with atomic or near-atomic lateral
                 and vertical resolution. Many physical and chemical
                 properties of surfaces and interfaces are sensitive to,
                 and in some cases determined by, random roughness or
                 surface disorder, although our understanding is
                 hampered by the lack of suitable techniques for
                 investigating atomic-scale features. We present STM
                 results for microcrystalline Ag and nanocrystalline
                 silicon surfaces which demonstrate the unique
                 topographic data obtainable using the STM. For
                 comparison, the STM studies are complemented by data
                 obtained using conventional techniques. The ability of
                 the STM to investigate the influence of growth
                 conditions on surface morphology, such as ion
                 bombardment, adsorption, and condensation temperature,
                 is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6116D (Electron microscopy determinations); A6480G
                 (Microstructure); A6820 (Solid surface structure);
                 B2390 (Electron and ion microscopes); B2520C (Elemental
                 semiconductors); B2550 (Semiconductor device
                 technology); B7320C (Spatial variables)",
  classification = "547; 549; 712; 741; 933; 941",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adsorption; atomic-; bombardment; condensation
                 temperature; crystal microstructure; crystals ---
                 Microstructure; design; elemental semiconductors;
                 influence of growth conditions; ion; measurement;
                 microcrystalline Ag; Microscopic Examination;
                 nanocrystalline Si; nanocrystalline silicon surfaces;
                 random roughness; rough surfaces; scale features;
                 scanning; scanning tunneling microscope; scanning
                 tunneling microscopy; scanning tunnelling microscopy;
                 semiconducting silicon; semiconductors; silicon;
                 silver; silver and alloys --- Microscopic Examination;
                 STM; STM results; surface microstructure; surface
                 morphology; surface topography; topographic data
                 obtainable; topography; tunnelling microscopy",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Durig:1986:NFO,
  author =       "Urs D{\"u}rig and Dieter Pohl and Flavio Rohner",
  title =        "Near-Field Optical Scanning Microscopy with
                 Tunnel-Distance Regulation",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "478--483",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Optical image resolution (20 nm to 30 nm) has been
                 obtained with a near-field optical scanner using light
                 with a wavelength of half a micrometer. The key element
                 is an extremely small aperture (approx. 10 nm) placed
                 at the very top of a pyramidal screen. The aperture is
                 scanned in the immediate proximity of the surface to be
                 investigated, using vacuum tunneling to sense the
                 distance. The amount of light transmitted by both the
                 aperture and the sample depends sensitively on the
                 optical properties of the sample in the immediate
                 vicinity of the aperture.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0760P (Optical microscopy)",
  classification = "741; 933; 941",
  corpsource =   "IBM Zurich Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.5 micron; 10 nm; 20 to; 30 nm; design; extremely
                 small aperture; image resolution; key element;
                 materials --- Microscopic Examination; microscopic
                 examination; near-field; near-field optical scanner;
                 NFOS; operation; optical microscopy; optical scanner;
                 optical scanning microscopy; Performance; pyramidal
                 screen; tunnel-distance regulation; vacuum tunneling",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "N New Development; X Experimental",
}

@Article{West:1986:CAS,
  author =       "Paul West and John Kramar and David V. Baxter and
                 Robert J. Cave and John D. Baldeschwieler",
  title =        "Chemical Applications of Scanning Tunneling
                 Microscopy",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "484--491",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The development of a scanning tunneling microscope at
                 the California Institute of Technology is well under
                 way. Electron tunneling has been demonstrated, and
                 preliminary surface images of gold films have been
                 obtained. Additional instrumental development is
                 required to achieve the atomic resolution which is
                 required for the study of chemical processes on
                 surfaces. A theoretical model is also being developed
                 for the study of tunneling of electrons from the probe
                 to surfaces with molecular species intervening between
                 the probe and the surface. These experimental tools and
                 theoretical models, which are being developed
                 concurrently, will be applied to study of chemical
                 systems and processes on surfaces. Some of the first
                 molecular species for study will include benzene and
                 pyridine on metal surfaces, and porphyrins and
                 phthalocyanines on pyrolytic graphite.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6845B (Sorption equilibrium); A8265J (Heterogeneous
                 catalysis at surfaces and other surface reactions);
                 B2390 (Electron and ion microscopes)",
  classification = "741; 801; 941; 942",
  corpsource =   "Surface Sci. Lab., Aerojet Electro Systems Co., Azusa,
                 CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adsorbed layers; Applications; atomic resolution;
                 benzene; chemistry; design; electrons --- Tunneling;
                 experimentation; materials --- Chemistry; measurement;
                 metal surfaces; microscope; microscopes, electron;
                 molecular species; on surfaces; phthalocyanines;
                 porphyrins; pyridine; pyrolytic graphite; scanning
                 tunneling; scanning tunneling microscopy; scanning
                 tunnelling microscopy; STM; study of chemical
                 processes; surface; surface chemistry; theoretical
                 model; theory",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Chemistry \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies",
  treatment =    "A Application",
}

@Article{Abraham:1986:SMS,
  author =       "David W. Abraham and H. Jonathon Mamin and Eric Ganz
                 and John Clarke",
  title =        "Surface Modification with the Scanning Tunneling
                 Microscope",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "492--499",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We describe the design and operation of a scanning
                 tunneling microscope (STM) for studying surfaces. We
                 are able to prepare samples with ion bombardment and
                 heating, and to characterize them with LEED and Auger
                 analysis in situ before scanning with the STM. Data
                 acquisition and analysis are computer-controlled, with
                 a variety of options for presentation. In the near
                 future, we will be able to load-lock samples without
                 venting the UHV chamber. Our STM has very low thermal
                 drift, typically of the order of 1 A/min. In addition
                 to topographical measurements of the surface, we have
                 obtained spatially resolved maps related to the height
                 of the tunnel barrier. We have investigated the effects
                 of scratching the surface with the tip, and have also
                 succeed in depositing material from the tip onto the
                 surface. Surface diffusion of material is found to play
                 an important role in both of these processes.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); B2390
                 (Electron and ion microscopes)",
  classification = "741; 931; 933",
  corpsource =   "Center for Adv. Mater., Lawrence Berkeley Lab., CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Auger analysis; design; electrons --- Tunneling;
                 height; ion bombardment; LEED; load-lock samples; low
                 thermal drift; microscopes, electron; Microscopic
                 Examination; operation; performance; resolved maps;
                 sample preparation; scanning tunneling microscope;
                 scanning tunnelling microscopy; spatially; STM; surface
                 diffusion; surfaces; topographical measurements; tunnel
                 barrier; UHV chamber",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies",
  treatment =    "A Application; N New Development; X Experimental",
}

@Article{Ringger:1986:SAA,
  author =       "M. Ringger and B. W. Corb and H.-R. Hidber and R.
                 Schloegl and R. Wiesendanger and A. Stemmer and L.
                 Rosenthaler and A. J. Brunner and P. C. Oelhafen and
                 H.-J. Guentherodt",
  title =        "{STM} Activity at the {University of Basel}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "500--508",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have built a scanning tunneling microscope (STM)
                 with a design similar to that published by Binnig and
                 Rohrer. An electromagnetic device called the `maggot'
                 has been developed for nanometer-scale movement over a
                 wide temperature range. We have studied the surface
                 topography of a Pd(100) single crystal, of a glassy
                 Pd$_{81}$Si$_{19}$ alloy, and of
                 graphite. Nanometer-scale structures have been produced
                 with the STM, indicating its potential for
                 high-resolution microfabrication.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6820 (Solid surface structure); B2390 (Electron and
                 ion microscopes)",
  classification = "547; 549; 714; 741; 933; 941",
  corpsource =   "Inst. of Phys., Basel Univ., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "C; crystals; design; electromagnetic device;
                 experimentation; glassy Pd/sub 81/Si/sub 19/ alloy;
                 graphite; high-resolution; high-resolution
                 microfabrication; integrated circuit manufacture;
                 maggot; measurement; metallic glasses;
                 microfabrication; Microscopic Examination;
                 nanometer-scale movement; nanometer-scale structures;
                 nanometre actuator; palladium; palladium alloys;
                 palladium silicon alloys --- Microscopic Examination;
                 Pd; performance; scanning; scanning tunneling
                 microscope (STM); scanning tunnelling microscopy;
                 silicon alloys; single crystal; STM; surface
                 topography; surfaces --- Microscopic Examination;
                 tunneling microscope; University of Basel",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "P Practical; X Experimental",
}

@Article{vanKempen:1986:AHS,
  author =       "H. {van Kempen} and G. F. A. {van de Walle}",
  title =        "Applications of a High-Stability Scanning Tunneling
                 Microscope",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "509--514",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have constructed a scanning tunneling microscope
                 which is quite insensitive to vibrations and has a low
                 thermal drift. Low thermal drift is obtained by using a
                 compensating structure for the z-axis (perpendicular to
                 the sample surface) of the scan unit and by utilizing
                 symmetry in the x-and y-directions. To get a low
                 sensitivity to vibrations, we made the scanning unit
                 compact and rigid. A very light tip holder construction
                 allows a high scan speed. We studied different surfaces
                 of Ag single crystals and compared the results with a
                 study of the same surfaces from the inside by a method
                 based on the use of focused conduction electrons. A
                 terrace surface model, introduced to explain the
                 focusing results, has been confirmed for the Ag(001)
                 surface. A description of tip preparation and tip shape
                 is given.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); A6820
                 (Solid surface structure); B2390 (Electron and ion
                 microscopes)",
  classification = "547; 741; 932; 933; 941",
  corpsource =   "Res. Inst. for Mater., Nijmegen Univ., Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Ag single crystals; axis; compact rigid microscope;
                 compensating structure; crystals; design; electrons ---
                 Tunneling; experimentation; focused conduction
                 electrons; high scan; high-; insensitive to; light tip
                 holder construction; low sensitivity; low thermal
                 drift; measurement; Microscopic Examination; scanning
                 tunneling microscope; scanning tunnelling microscopy;
                 silver; silver and alloys --- Microscopic Examination;
                 single crystals; speed; stability scanning tunneling
                 microscope; surface structure; surface topography
                 measurement; terrace surface model; tip holder; tip
                 preparation; tip shape; topography measurement;
                 vibrations; y-directions; z-",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "A Application; X Experimental",
}

@Article{Chiang:1986:CUS,
  author =       "S. Chiang and R. J. Wilson",
  title =        "Construction of a {UHV} Scanning Tunneling
                 Microscope",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "515--519",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have built an ultrahigh-vacuum tunneling microscope
                 (STM). The STM is mounted onto one flange in an
                 ultrahigh-vacuum chamber which is connected by a
                 transfer chamber to a surface-analysis system equipped
                 with 500-A-resolution SAM\slash SEM, XPS, LEED, and
                 sample-heating and sample-cleaning facilities. Samples
                 and tips can be moved throughout the combined vacuum
                 system. We describe the design and performance of the
                 instrument and show some preliminary data on Si(111).
                 We also show some recent results of experiments on tip
                 preparation.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); A6820
                 (Solid surface structure); B2390 (Electron and ion
                 microscopes); B2520C (Elemental semiconductors); B2550
                 (Semiconductor device technology); B7320C (Spatial
                 variables)",
  classification = "549; 633; 712; 741; 941",
  corpsource =   "IBM Almaden Res. Center, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis system; construction; design; elemental
                 semiconductors; experimentation; measurement;
                 microscope; microscopes; performance; preliminary data;
                 preparation; samples and tips; scanning tunneling
                 microscope; scanning tunnelling microscopy;
                 semiconducting silicon; semiconductor; Si surface;
                 silicon; silicon and alloys --- Microscopic
                 Examination; STM; surface structure; surface topography
                 measurement; surface-; tip; tip preparation; transfer
                 chamber; UHV scanning tunneling; ultrahigh-vacuum
                 chamber; ultrahigh-vacuum scanning tunneling
                 microscope; Vacuum Applications",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Berghaus:1986:STM,
  author =       "Th. Berghaus and H. Neddermeyer and St. Tosch",
  title =        "A scanning tunneling microscope for the investigation
                 of the growth of metal films on semiconductor
                 surfaces",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "520--524",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We describe a scanning tunneling microscope which is
                 part of an apparatus designed for the investigation of
                 metal-semiconductor surfaces. The main parts of the
                 tunneling unit are the piezoelectric walker ('louse')
                 carrying the sample for the coarse approach and a
                 piezoelectric xyz system for movement of the tip. The
                 xyz system is self-compensating with regard to uniform
                 thermal expansion. Our first measurements have been
                 obtained on a Au(110) surface. The spatial resolution
                 allows the observation of monoatomic steps. Corrugation
                 perpendicular to the rows and troughs of the (110)
                 surface with an amplitude around 1 A is also visible.
                 The noise in the z direction under optimum conditions
                 is smaller than 0.2 A rms.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6116D (Electron microscopy determinations); A6855
                 (Thin film growth, structure, and epitaxy); B2390
                 (Electron and ion microscopes)",
  classification = "531; 539; 712; 741; 933; 941",
  corpsource =   "Inst. for Exp. Phys., Ruhr-Univ., Bochum, West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Au; corrugation amplitude; crystals --- Microscopic
                 Examination; design; experimentation; films ---
                 Metallic; gold; Growth; growth of metal films;
                 investigation; measurement; metal-semiconductor
                 surfaces; metallisation; monoatomic steps; noise;
                 observation of monoatomic steps; of metal-semiconductor
                 surfaces; piezoelectric devices; piezoelectric walker;
                 piezoelectric xyz system; resolution; scanning
                 tunneling microscope; scanning tunnelling microscopy;
                 semiconductor materials; semiconductor surfaces;
                 semiconductor-metal boundaries; spatial; STM; surface;
                 uniform thermal expansion",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "X Experimental",
}

@Article{Aguilar:1986:STM,
  author =       "M. Aguilar and P. J. Pascual and A. Santisteban",
  title =        "Scanning Tunneling Microscope Automation",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "525--532",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A computerized system for scanning tunneling
                 microscope control, data acquisition, and display is
                 presented. It is based on the IBM Personal Computer
                 Model XT or AT. An IBM Data Acquisition and Control
                 Adapter card is used for the PC to control the
                 electronic equipment and to measure the voltages
                 applied to the three STM piezoelectric elements and the
                 tunneling current. An IBM Professional Graphics
                 Controller card is used for real-time display of the
                 STM `images'. The software has been designed in a
                 modular way to allow the replacement of these cards and
                 other improvements to the equipment. A discussion of
                 performance (scanning speed and size of images) is
                 included. Some image analysis and display tools are
                 included for a posteriori image processing.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 B2390 (Electron and ion microscopes); B7210B (Automatic
                 test and measurement systems); C3380L (Laboratory
                 techniques); C7320 (Physics and Chemistry)",
  classification = "722; 723; 741; 941",
  corpsource =   "Inst. of Solid-State Phys., Autonomous Univ. of
                 Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "a posteriori; automation; Computer Applications;
                 computer graphics; computerised instrumentation;
                 computerized system; computers, personal; data
                 acquisition; Data Acquisition and control Adapter card;
                 data processing --- Data Acquisition; design; display
                 tools; Graphics Controller card; IBM; IBM personal
                 computer; IBM Professional; image analysis; image
                 processing; image size; microcomputer applications;
                 microscopes; PC AT; PC XT; performance; piezoelectric
                 elements; real-time display; scanning speed; scanning
                 tunneling microscope; scanning tunneling microscope
                 control; scanning tunnelling microscopy; size of
                 images; STM; tunneling current",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics \\ J.6 Computer Applications,
                 COMPUTER-AIDED ENGINEERING",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Garcia:1986:TST,
  author =       "N. Garcia",
  title =        "Theory of Scanning Tunneling Microscopy and
                 Spectroscopy: Resolution, Image and Field States, and
                 Thin Oxide Layers",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "533--542",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Theoretical studies on the scanning tunneling
                 microscope and its spectroscopic version are reviewed.
                 This research has shown that the conductance of the
                 tunneling electrons is strongly influenced by the
                 classical image potential. The introduction of this
                 potential increases the conductance, although the slope
                 of the logarithm of the conductance versus electrode
                 separation remains practically constant. The image
                 force also has focusing effects on the tunneling
                 electrons and produces a minimum in the resolution for
                 approx. 5 A electrode separation. Spectroscopic levels
                 have been calculated for the image states held by the
                 tunneling potential. The results agree with
                 experimental data and indicate that the evolution of
                 the observed tunneling spectroscopic levels with
                 applied field is sensitive to the image potential, and
                 that the whole series of image states can be obtained
                 by extrapolation to zero applied field. Work is also
                 presented on the theoretical aspects of tunneling
                 spectroscopy of thin oxide layers grown on a metal
                 substrate --- NiO on Ni(100).",
  acknowledgement = ack-nhfb,
  classcodes =   "A6116D (Electron microscopy determinations); A6848
                 (Solid-solid interfaces); A6855 (Thin film growth,
                 structure, and epitaxy); A7340G (Tunnelling: general);
                 B2390 (Electron and ion microscopes)",
  classification = "741; 801; 932; 933; 941",
  corpsource =   "Dept. of Fundamental Phys., Autonomous Univ. of
                 Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "5E-10 m; classical; conductance versus electrode
                 separation; design; electrons --- Tunneling;
                 experimental data; field states; focusing effects;
                 image force; image potential; image states; metal
                 substrate; microscopes; Ni; nickel; nickel compounds;
                 NiO-Ni; oxide layers; resolution; scanning tunneling
                 microscopy; scanning tunnelling microscopy;
                 spectroscopic levels; spectroscopic version;
                 spectroscopy --- Analysis; STM; theory; Theory; theory;
                 thin; thin oxide layers; tunneling electrons; tunneling
                 spectroscopy; tunnelling spectroscopy",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Schroer:1986:CAS,
  author =       "Peter H. Schroer and Jordan Becker",
  title =        "Computer Automation for Scanning Tunneling
                 Microscopy",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "543--552",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Computer automation has become a necessary part of the
                 scanning tunneling microscope (STM). We have designed a
                 data acquisition and image processing IBM PC\slash AT
                 workstation to complement the STM. The computer is used
                 to control the raster scans, to acquire multichannel
                 analog data, and to store the data for later analysis
                 both at the workstation and on a host computer. New
                 features include the use of PC\slash AT extended
                 memory, large backup storage, and image processing at
                 the workstation. Real-time gray-scale imaging provides
                 quick and comprehensive information to scientists and
                 engineers. The system is flexible enough to interface
                 with many microscope designs and with other laboratory
                 automation projects. A mainframe host computer system
                 is loosely coupled with the workstation to provide
                 off-line processing, hard copy, and mass storage.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0650 (Data handling and computation); A0780 (Electron
                 and ion microscopes and techniques); B2390 (Electron
                 and ion microscopes); C7320 (Physics and Chemistry)",
  classification = "722; 723; 741; 933; 941",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "backup storage; comprehensive data acquisition;
                 Computer Applications; computerised instrumentation;
                 computers, personal; data processing --- Data
                 Acquisition; design; extended; features; gray-scale
                 imaging; hard copy; host computer; image processing ---
                 Computer Applications; image processing IBM PC/AT; line
                 processing; mainframe host computer system; mass
                 storage; memory; microscopes; microscopy; multichannel
                 analog data; off-; real time gray scale imaging;
                 scanning tunneling; scanning tunneling microscope;
                 scanning tunneling microscopy; scanning tunnelling
                 microscopy; STM; workstation",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ J.6 Computer Applications,
                 COMPUTER-AIDED ENGINEERING",
  treatment =    "G General Review; X Experimental",
}

@Article{Vieira:1986:BCS,
  author =       "S. Vieira",
  title =        "The behavior and calibration of some piezoelectric
                 ceramics used in the {STM}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "5",
  pages =        "553--556",
  month =        sep,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The high resolution and displacement measurement in
                 the scanning tunneling microscope are dependent upon
                 the behavior of the piezoelectric ceramics used for
                 moving the tip. Certain characteristics and features of
                 piezoelectric ceramics relevant to the desired
                 precision are discussed. These characteristics are the
                 relaxation aftereffects that follow the change of the
                 applied electric field, and the temperature dependence
                 of the piezoelectric response. The above effects have
                 been analyzed in four commercial piezoelectric ceramics
                 by the three-terminal capacitance measurement
                 technique.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0620H (Measurement standards and calibration); A0780
                 (Electron and ion microscopes and techniques); A7760
                 (Piezoelectricity and electrostriction); B2390
                 (Electron and ion microscopes); B2860 (Piezoelectric
                 and ferroelectric devices); B7130 (Measurement
                 standards and calibration); B7310Z (Other electric
                 variables); B7320C (Spatial variables)C3120C (Spatial
                 variables); C3240D (Electric transducers and sensing
                 devices); C3260B (Electric equipment)",
  classification = "708; 714; 741; 812; 941",
  corpsource =   "Dept. of Fundamental Phys., Autonomous Univ. of
                 Madrid, Spain",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "actuators; atomic resolutions; behavior; calibration;
                 ceramic materials --- Piezoelectric; characteristics;
                 characteristics measurement; design; displacement
                 measurement; electric; experimentation; features; high
                 resolution; measurement; measurement technique;
                 micrometry; microscopes; microscopy; Performance;
                 piezoelectric ceramics; piezoelectric devices;
                 piezoelectric response; piezoelectricity; position
                 control; relaxation aftereffects; scanning tunneling
                 microscope; scanning tunnelling; scanning tunnelling
                 microscopy; STM; temperature dependence; three-terminal
                 capacitance; three-terminal capacitance measurement",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Standard cells \\ J.2 Computer Applications,
                 PHYSICAL SCIENCES AND ENGINEERING, Electronics",
  treatment =    "X Experimental",
}

@Article{Carnevali:1986:MIM,
  author =       "Paolo Carnevali and Piero Sguazzero and Vittorio
                 Zecca",
  title =        "Microtasking on {IBM} Multiprocessors",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "574--582",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The demand for very high computing performance has
                 become increasingly common in many scientific and
                 engineering environments. In addition to vector
                 processing, parallel computing is now considered a
                 useful way to enhance performance. However, parallel
                 computing tends to be unpopular among users because,
                 with presently available technology and software, it
                 requires explicit programmer intervention to exploit
                 architectural parallelism. This intervention can be
                 minor in some cases, but it often requires a
                 nonnegligible amount of program restructuring, or even
                 a reformulation of some of the algorithms used. In
                 addition, it makes program debugging considerably more
                 difficult. Tools for interprocedural program analysis,
                 able to analyze at high levels large FORTRAN programs
                 composed of many subroutines and to perform an
                 automatic high-level parallel decomposition, are being
                 developed at IBM. As an additional possibility,
                 low-level parallelism could also be exploited
                 automatically. This would greatly simplify the program
                 analysis needed in a compiler in order to automatically
                 insert parallel constructs in a program. However, this
                 could only be efficient in an environment in which the
                 cost for scheduling and synchronizing parallel
                 activities is extremely small. Such a `microtasking'
                 environment has been realized, at a prototype level,
                 for IBM multiprocessors and is described in this
                 paper.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5440 (Multiprocessor systems and techniques); C6140D
                 (High level languages); C6150C (Compilers, interpreters
                 and other processors); C6150J (Operating systems)",
  classification = "722; 723",
  corpsource =   "IBM Eur. Center for Sci. and Eng. Co., Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Assembler level; assemblers; automatic high-level
                 parallel decomposition; compiler; computer
                 architecture; computer operating systems --- Program
                 Compilers; computer systems, digital; design;
                 fine-grain problems; FORTRAN; IBM computers; IBM
                 multiprocessors; interprocedural program analysis;
                 languages; low-level; microtasking; Multiprocessing;
                 multiprocessing programs; parallelism; performance;
                 program; program compilers; speed-ups; subroutines;
                 theory",
  subject =      "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Modes of Computation, Parallelism \\ C.4
                 Computer Systems Organization, PERFORMANCE OF SYSTEMS
                 \\ D.3.4 Software, PROGRAMMING LANGUAGES, Processors",
  treatment =    "P Practical",
}

@Article{Driscoll:1986:CAY,
  author =       "Graham C. {Driscoll, Jr.} and Donald L. Orth",
  title =        "Compiling {APL}: the {Yorktown APL} Translator",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "583--593",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Yorktown APL Translator (YAT) permits functions
                 written in APL to be compiled using an existing
                 compiler for part of the process. It also creates
                 tables that allow the APL2 Release 2 interpreter to
                 call the compiled code. The code can also be called
                 from a Fortran main routine. This paper outlines the
                 history of APL compilation, the motivation for
                 producing YAT, the design choices that were made, and
                 the manner of implementation. Sample APL functions and
                 their translations are shown, and the time required to
                 interpret these functions is compared with the time
                 required to execute the compiled code. Possible further
                 work is discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "APL; APL2 Release 2; compiled code; compiler; computer
                 operating systems; computer programming languages ---
                 Problem Orientation; design; Fortran main routine;
                 interpreter; languages; program compilers; Program
                 Compilers; program interpreters; YAT; Yorktown APL
                 translator; Yorktown APL translator (YAT)",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, APL \\ D.3.4 Software, PROGRAMMING
                 LANGUAGES, Processors",
  treatment =    "P Practical",
}

@Article{Ching:1986:PAC,
  author =       "Wai-Mee Ching",
  title =        "Program Analysis and Code Generation in an {APL\slash
                 370} Compiler",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "594--602",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have implemented an APL\slash 370 compiler which
                 accepts a subset of APL that includes most language
                 features and a majority of APL primitive functions. It
                 produces System\slash 370 assembly code directly to be
                 run independently of an interpreter. The compiler does
                 not require variable declarations. Its front end, which
                 is machine-independent, employs extensive type-shape
                 analysis based on a type-shape calculus of the
                 primitive functions and global dataflow analysis. Its
                 back end does storage mapping, code generation for
                 various primitive functions, and register management.
                 For one-line functions, compiled code executes at 2-10
                 times the speed of the interpreter. On programs with
                 many iterations, the execution time of the compiled
                 code not only is dramatically better than that of
                 interpretation, but is actually fairly close to that of
                 FORTRAN. This removes the performance penalty of APL in
                 computation-intensive applications.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; APL; APL/370 compiler; apl/370 compiler;
                 code generation; computer operating systems; computer
                 programming languages --- Problem Orientation; design;
                 execution time; global dataflow; language features;
                 languages; mapping; performance; primitive functions;
                 program compilers; Program Compilers; register
                 management; storage; System/370 assembly code;
                 type-shape; type-shape calculus",
  subject =      "D.3.4 Software, PROGRAMMING LANGUAGES, Processors,
                 Code generation \\ D.3.4 Software, PROGRAMMING
                 LANGUAGES, Processors, Compilers \\ D.2.4 Software,
                 SOFTWARE ENGINEERING, Program Verification",
  treatment =    "P Practical",
}

@Article{Cytron:1986:AOG,
  author =       "Ron Cytron and Paul G. Loewner",
  title =        "An automatic overlay generator",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "603--608",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We present an algorithm for automatically generating
                 an overlay structure for a program, with the goal of
                 reducing the primary storage requirements of that
                 program. Subject to the constraints of intermodule
                 dependences, the algorithm can either find a maximal
                 overlay structure or find an overlay structure that,
                 where possible, restricts the program to a specified
                 amount of primary storage. Results are presented from
                 applying this algorithm to three substantial
                 programs.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6115 (Programming support); C6120 (File
                 organisation)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; automatic overlay generator; computer
                 programming --- Algorithms; computer systems
                 programming; design; intermodule dependences;
                 languages; overlay generators; primary storage
                 requirements; software tools; storage management;
                 Supervisory and Executive Programs",
  subject =      "D.3.3 Software, PROGRAMMING LANGUAGES, Language
                 Constructs, Data types and structures",
  treatment =    "P Practical",
}

@Article{Huynh:1986:EAF,
  author =       "Tien Huynh and Brent Hailpern and Lee W. Hoevel",
  title =        "An execution architecture for {FP}",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "609--616",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "FP is a functional programming language proposed by
                 John Backus to liberate programming from the `von
                 Neumann style.' We define here an architecture (FP
                 machine model) that is intended to allow easy and
                 efficient implementation of FP on a conventional von
                 Neumann machine. We present a new execution
                 architecture for FP based on Johnston's contour model
                 and on Hoevel and Flynn's notion of DEL\slash DCA
                 architectures. We call our architecture DELfp, a
                 Directly Executed Language for FP.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150J (Operating
                 systems)",
  classification = "722",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; computer programming languages
                 --- Machine Orientation; DEL/DCA architectures; design;
                 directly executed language; Directly Executed Language;
                 execution architecture; FP; functional programming;
                 functional programming language; high level languages;
                 Johnston's contour; languages; machine model; model;
                 Neumann machine; supervisory programs; von",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, FP \\ D.3.4 Software, PROGRAMMING
                 LANGUAGES, Processors, Compilers \\ D.3.4 Software,
                 PROGRAMMING LANGUAGES, Processors, Interpreters",
  treatment =    "P Practical",
}

@Article{Moura:1986:EED,
  author =       "A. V. Moura",
  title =        "Early Error Detection in Syntax-Driven Parsers",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "617--626",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "633.68076",
  abstract =     "The early error detection capabilities of
                 syntax-driven parsers are studied. The classes of weak
                 precedence and simple mixed-strategy precedence parsers
                 are chosen as the object of study. Very similar
                 techniques could be used to obtain related results for
                 other classes of syntax-driven parsers. We investigate
                 whether the correct-prefix and the viable-prefix
                 properties can be enforced within these classes: A
                 negative result is obtained for the first class and a
                 positive one for the second. Moreover, for the simple
                 mixed-strategy class the relationship between early
                 error detection and parser size is studied. Some lower
                 bounds on the parser size are proven for simple
                 mixed-strategy precedence parsers that have the
                 viable-prefix property.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6150C (Compilers, interpreters and other
                 processors)",
  classification = "722; 723",
  corpsource =   "IBM Software Technol. Center, Sao Paulo, Brazil",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computer operating systems; computer
                 systems programming; correct prefix properties; early;
                 error detection; grammars; languages; mixed-strategy
                 precedence; performance; precedence parsers; program
                 compilers; Program Compilers; reliability;
                 syntax-driven parsers; theory; verification;
                 viable-prefix properties; weak precedence",
  subject =      "D.3.4 Software, PROGRAMMING LANGUAGES, Processors,
                 Parsing \\ F.4.2 Theory of Computation, MATHEMATICAL
                 LOGIC AND FORMAL LANGUAGES, Grammars and Other
                 Rewriting Systems, Parsing",
  treatment =    "P Practical",
}

@Article{LAbbate:1986:CAT,
  author =       "A. L'Abbate and C. Paoli and R. Porinelli and M. G.
                 Trivella",
  title =        "A computerized autoradiographic technique for the
                 simultaneous high-resolution mapping of myocardial
                 blood flow and metabolism",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "627--634",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "By using both radioactive particulate and diffusible
                 tracers, combined with computerized processing and
                 analysis of generated autoradiographs, a new technique
                 for the high-resolution mapping of organ blood flow and
                 metabolism has been developed. In this paper the
                 technique has been evaluated for the myocardium.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8745H (Haemodynamics, pneumodynamics); A8760J
                 (Corpuscular radiation and radioisotopes); A8770E
                 (Diagnostic methods and instrumentation); C7330
                 (Biology and medicine)",
  classification = "461",
  corpsource =   "Inst. of Clinical Physiol., Nat. Council of Res.,
                 Pisa, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "autoradiography; biological materials --- Blood;
                 biomedical engineering --- Computer Aided Diagnosis;
                 cardiology; computerized autoradiographic technique;
                 design; Diagnostic Applications; diffusible;
                 haemodynamics; high-resolution; human factors; mapping;
                 measurement; metabolism; myocardial blood flow;
                 myocardium; radiography; radioisotope scanning and
                 imaging; tracers",
  subject =      "J.3 Computer Applications, LIFE AND MEDICAL SCIENCES,
                 Health \\ I.4.9 Computing Methodologies, IMAGE
                 PROCESSING, Applications",
  treatment =    "P Practical; X Experimental",
}

@Article{Winarski:1986:MDC,
  author =       "Daniel J. Winarski and William W. Chow and Joseph G.
                 Bullock and Frederick B. Froehlich and Thomas G.
                 Osterday",
  title =        "Mechanical Design of the Cartridge and Transport for
                 the {IBM 3480} Magnetic Tape Subsystem",
  journal =      j-IBM-JRD,
  volume =       "30",
  number =       "6",
  pages =        "635--644",
  month =        nov,
  year =         "1986",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The IBM 3480 Magnetic Tape Subsystem has achieved
                 significant improvements over its predecessor, the
                 3420, in speed, data density, and floor-space
                 requirements. The 3-megabyte-per-second data rate of
                 the 3480, which is 2.4 times that of the 3420, was
                 accomplished through the use of chromium-dioxide tape
                 stored in a compact, single-reel cartridge threaded to
                 a take-up reel. A sixfold increase in data density over
                 the 3420 allowed reduction of the size of the 3480
                 reel, which was essential for rapid acceleration of the
                 tape in the 3480's reel-to-reel transport. The
                 increased data density also demanded substantial
                 improvements in tape guiding and tape-motion control.
                 This paper describes how mechanical analysis and design
                 contributed to the achievement of these advances and
                 aided in overcoming the ensuing problems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media)",
  classification = "721; 722",
  corpsource =   "IBM Gen. Products Div., Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cartridge; computer peripheral equipment; CrO$_2$
                 tape; data density; data storage, magnetic; design;
                 floor-space requirements; IBM 3480; IBM 3480 magnetic
                 tape subsystem; magnetic tape equipment; magnetic tape
                 storage; magnetic tape subsystem; speed; Tape; tape
                 guiding; tape-motion control; transport",
  subject =      "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
                 C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS",
  treatment =    "N New Development; P Practical",
}

@Article{Goertzel:1987:DHI,
  author =       "Gerald Goertzel and Gerhard R. Thompson",
  title =        "Digital Halftoning on the {IBM 4250} Printer",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "2--15",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A method of reproducing high-quality continuous-tone
                 images via the IBM 4250 Printer is presented. The
                 approach is modeled on the halftone process used in
                 conventional lithography but is adapted to discrete
                 bilevel printing and digital processing. We use a
                 combination of standard and novel techniques. These
                 include generation and calibration of a set of halftone
                 dot patterns, randomized error propagation in pattern
                 selection, and resolution enhancement in areas of high
                 intensity gradients. The resultant images have good
                 gray-scale rendition and sharp edges without the
                 problems of contouring and worminess often associated
                 with digital image reproduction. We have named this
                 approach PREPRESS: Picture Rendition using Error
                 Propagation and Resolution Enhancement in Simulated
                 Screening.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 723; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; calibration; computer peripheral
                 equipment; contouring; digital; digital image
                 reproduction; discrete bilevel printing; dot patterns;
                 error propagation; gradients; halftone process; high
                 intensity; high-quality continuous-tone images; IBM
                 4250 printer; image processing --- Enhancement;
                 lithography; pattern selection; Picture Rendition;
                 PREPRESS; Printers; printers; printing; processing;
                 resolution enhancement; sharp edges; Simulated
                 Screening; worminess",
  subject =      "H.4.1 Information Systems, INFORMATION SYSTEMS
                 APPLICATIONS, Office Automation, Equipment \\ B.4.2
                 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
                 Input/Output Devices, Data terminals and printers \\
                 I.3.1 Computing Methodologies, COMPUTER GRAPHICS,
                 Hardware architecture, Hardcopy devices \\ I.3.3
                 Computing Methodologies, COMPUTER GRAPHICS,
                 Picture/Image Generation, Digitizing and scanning",
  treatment =    "P Practical",
}

@Article{Anderson:1987:BAI,
  author =       "K. L. Anderson and F. C. Mintzer and G. Goertzel and
                 J. L. Mitchell and K. S. Pennington and W. B.
                 Pennebaker",
  title =        "Binary-Image-Manipulation Algorithms in the Image View
                 Facility",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "16--31",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Most current implementations of electronic mail deal
                 primarily with coded information. A
                 scanned-document-handling system that could scan a
                 document, distribute it, display it on terminals, and
                 print it on host-attached printers would offer a
                 similar convenience for documents in hard-copy rather
                 than coded form. For such a system to be practical,
                 fast software is needed for a number of
                 image-manipulation functions. The required functions
                 are compression, to reduce the size of the data files;
                 decompression, to reconstruct the scanned document;
                 scaling, to match the resolution of the scan to the
                 resolution of the display or printer; and rotation, to
                 reorient documents scanned sideways or upside down.
                 This paper describes a collection of algorithms
                 underlying fast software for manipulating binary images
                 that is used in the Image View Facility, a System\slash
                 370-based software package that permits the display and
                 printing of binary images at various resolutions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210G (Electronic mail); C5260 (Digital signal
                 processing)",
  classification = "723; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; coded information; compression; computer
                 programming --- Algorithms; computerised picture
                 processing; decompression; electronic mail;
                 host-attached printers; image processing; Image View
                 Facility; image-manipulation functions; performance;
                 rotation; scaling; scanned-document-handling system;
                 System/370-based software package",
  subject =      "I.4.0 Computing Methodologies, IMAGE PROCESSING,
                 General \\ H.4.1 Information Systems, INFORMATION
                 SYSTEMS APPLICATIONS, Office Automation, Equipment \\
                 H.4.3 Information Systems, INFORMATION SYSTEMS
                 APPLICATIONS, Communications Applications, Electronic
                 mail",
  treatment =    "N New Development; P Practical",
}

@Article{Chen:1987:PPA,
  author =       "Yi-Hsin Chen and Frederick C. Mintzer and Keith S.
                 Pennington",
  title =        "{Panda}: {Processing Algorithm for Noncoded Document
                 Acquisition}",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "32--43",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "With a scanned-document-handling system, documents can
                 be scanned, stored, transmitted to remote locations,
                 viewed on displays and terminals, edited, and printed.
                 These systems hold much promise for office automation,
                 since they facilitate the communication and storage of
                 information that is not easily recoded into the
                 traditional formats for text and graphics. However,
                 most of the current systems that perform these
                 functions are intended for documents that at every
                 point are either black or white, but not gray. These
                 systems effectively exclude documents that contain
                 regions with varying shades of gray (known as
                 continuous-tone regions). PANDA, the Processing
                 Algorithm for Noncoded Document Acquisition, is a
                 technique that processes mixed documents, those that
                 contain continuous-tone regions in addition to text,
                 graphics, and line art. PANDA produces a high-quality
                 binary representation of all regions of a mixed
                 document. Furthermore, all regions of the binary
                 representation, including the continuous-tone image
                 regions, are significantly compressed by the
                 run-length-based compression algorithms that underlie
                 scanned-document-handling systems. This is a key
                 feature of PANDA. Indeed, this compression makes
                 practical the inclusion of mixed documents into many
                 existing systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5260 (Digital signal processing); C7104 (Office
                 automation)",
  classification = "723; 731; 741",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Applications; binary representation;
                 computerised picture processing; continuous-tone
                 regions; high-quality; image processing; information
                 theory --- Data Compression; mixed documents; Noncoded
                 Document Acquisition; office automation; PANDA;
                 performance; Processing Algorithm;
                 scanned-document-handling system",
  subject =      "I.4.1 Computing Methodologies, IMAGE PROCESSING,
                 Digitization, Scanning \\ I.4.3 Computing
                 Methodologies, IMAGE PROCESSING, Enhancement, Grayscale
                 manipulation",
  treatment =    "N New Development; P Practical",
}

@Article{Gupta:1987:YAD,
  author =       "Satish Gupta and David F. Bantz and Paul N. Sholtz and
                 Carlo J. Evangelisti and William R. DeOrazio",
  title =        "{YODA}: an Advanced Display for Personal Computers",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "44--57 (or 44--56??)",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "YODA (the YOrktown Display Adapter) is an experimental
                 display designed to improve the quality and speed of
                 users' interactions with personal computers. This paper
                 describes the YODA hardware architecture and software
                 design. Special attention is given to techniques used
                 for antialiasing. The various trade-offs and decisions
                 that were made are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5540 (Terminals and graphic displays)",
  classification = "721; 722; 723; 741",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(display); Adapter; advanced display; antialiasing;
                 computer graphic equipment; computer peripheral
                 equipment; computers, personal; display devices;
                 hardware architecture; personal computers; personal
                 computing; screens; software design; Terminals; YODA;
                 Yorktown Display; YOrktown Display Adapter (YODA)",
  subject =      "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
                 Input/Output Devices, Image display \\ I.4.3 Computing
                 Methodologies, IMAGE PROCESSING, Enhancement \\ D.2.6
                 Software, SOFTWARE ENGINEERING, Programming
                 Environments",
  treatment =    "N New Development; P Practical",
}

@Article{Chamberlin:1987:DCI,
  author =       "Donald D. Chamberlin",
  title =        "Document Convergence in an Interactive Formatting
                 System",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "58--72",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "One of the most complex aspects of document formatting
                 is the processing of references to remote objects such
                 as headings and figures. In the case of a forward
                 reference to an object that occurs later in the
                 document, two formatting passes are usually needed
                 before the document converges to a stable state. Some
                 documents require more than two passes to converge, and
                 cases are known of documents that never converge but
                 oscillate between two unstable states. This paper
                 describes the techniques used for resolving references
                 and detecting document convergence by the Interactive
                 Composition and Editing Facility, Version 2 (ICEF2).
                 ICEF2 is an interactive formatting system that allows
                 users to move about in a document, editing and
                 reformatting pages. The concepts of formatting pass and
                 document convergence are discussed in the context of
                 interactive formatting. A description is given of the
                 ICEF2 data store, a small relational database manager
                 with special features for detecting document
                 convergence. A sample ICEF2 style definition is
                 discussed to illustrate how ICEF2 deals with document
                 elements whose appearance depends on their location on
                 the page.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7106 (Word processing)",
  classification = "723",
  corpsource =   "IBM Almaden Res. Center, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; data processing --- Word Processing;
                 database systems; design; document convergence;
                 document formatting; Editing; Facility; formatting
                 passes; human factors; Interactive Composition;
                 interactive formatting system; interactive systems;
                 remote objects; text editing; Version 2",
  review =       "ACM CR 8804-0295",
  subject =      "I.7.2 Computing Methodologies, TEXT PROCESSING,
                 Document Preparation, Format and notation \\ I.7.2
                 Computing Methodologies, TEXT PROCESSING, Document
                 Preparation \\ H.1.2 Information Systems, MODELS AND
                 PRINCIPLES, User/Machine Systems, Human factors \\
                 H.2.1 Information Systems, DATABASE MANAGEMENT, Logical
                 Design",
  treatment =    "N New Development; P Practical",
}

@Article{Cowlishaw:1987:LPS,
  author =       "M. F. Cowlishaw",
  title =        "{LEXX} --- a Programmable Structured Editor",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "73--80",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Many sophisticated and specialized editing programs
                 have been developed in recent years. These editors help
                 people manipulate data, but the diversity complicates
                 rather than simplifies computer use. LEXX is an editing
                 program that can work with the syntax and structure of
                 the data it is presenting, yet is not restricted to
                 just one kind of data. It is used for editing programs,
                 documents, and other material and hence provides a
                 consistent environment for the user regardless of the
                 editing task. The new live parsing technique used by
                 LEXX means that it can be programmed to handle a very
                 wide variety of structured data. The structure
                 information is, in turn, used to improve the
                 presentation of data (through color, fonts, and
                 formatting), which makes it easier for people to deal
                 with the text being edited.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130D (Document processing techniques)",
  classification = "723",
  corpsource =   "IBM UK Ltd., Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming --- Structured Programming; data
                 processing; editing programs; editing task; fonts;
                 formatting; languages; LEXX; live parsing technique;
                 performance; programmable structured editor; structured
                 data; text editing; text editors programs; Word
                 Processing",
  subject =      "I.7.1 Computing Methodologies, TEXT PROCESSING, Text
                 Editing \\ E.1 Data, DATA STRUCTURES",
  treatment =    "N New Development; P Practical",
}

@Article{Mercer:1987:MES,
  author =       "Robert L. Mercer and Paul S. Cohen",
  title =        "A method for efficient storage and rapid application
                 of context-sensitive phonological rules for automatic
                 speech recognition",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "81--90",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In an automatic speech-recognition system, the
                 application of phonological rules to phonemic strings
                 in order to create phonetic graphs is a computationally
                 time-and storage-consuming process. A great many such
                 graphs must be constructed during the decoding phase;
                 thus it is important to be able to rapidly construct
                 phonetic graphs for strings of words from graphs of
                 individual words. However, because many phonological
                 rules operate across word boundaries or require
                 interword context, it is not possible to determine a
                 unique, context-independent phonetic graph for a word.
                 We describe a method for determining the phonetic graph
                 for a word in isolation, together with auxiliary
                 information to allow phonetic graphs for different
                 words to be rapidly interconnected to form a phonetic
                 graph for a string of words; the method also reduces
                 storage requirements significantly.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); B6130 (Speech analysis and processing
                 techniques); C5585 (Speech recognition and synthesis)",
  classification = "723; 751",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic speech recognition; computer programming ---
                 Algorithms; context-sensitive; context-sensitive
                 grammars; decoding; decoding phase; design; efficient
                 storage; interword context; languages; phonemic;
                 phonetic graphs; phonological rules; rapid application;
                 Recognition; speech; speech recognition; storage
                 requirements; string; strings",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Speech
                 recognition and understanding",
  treatment =    "P Practical",
}

@Article{Kurtzberg:1987:FAS,
  author =       "Jerome M. Kurtzberg",
  title =        "Feature Analysis for Symbol Recognition by Elastic
                 Matching",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "91--95",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A technique has been developed for the recognition of
                 unconstrained handwritten discrete symbols based on
                 elastic matching against a set of prototypes generated
                 by individual writers. The incorporation of feature
                 analysis with elastic matching to eliminate unlikely
                 prototypes is presented in this paper and is shown to
                 greatly reduce the required processing time without any
                 deterioration in recognition performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1250B (Character recognition)",
  classification = "723; 921",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "character recognition; computer programming ---
                 Algorithms; design; elastic matching; experimentation;
                 feature analysis; handwritten discrete symbols;
                 mathematical programming, dynamic; pattern recognition;
                 processing; recognition performance; symbol
                 recognition; time; unconstrained",
  subject =      "I.5.2 Computing Methodologies, PATTERN RECOGNITION,
                 Design Methodology, Feature evaluation and selection",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shield:1987:DFD,
  author =       "T. W. Shield and D. B. Bogy and F. E. Talke",
  title =        "Drop Formation by {DOD} Ink-Jet Nozzles: a Comparison
                 of Experiment and Numerical Simulation",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "96--110",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a comparison of a numerical
                 simulation of drop formation and ejection from a
                 drop-on-demand (DOD) ink-jet nozzle with experimental
                 observations from a particular nozzle-transducer
                 design. In the numerical simulation, first the pressure
                 waves in the transducer chamber are calculated using
                 inviscid compressible flow theory to obtain the
                 pressure history at the inner face of the nozzle plate.
                 Then a viscous momentum integral computation is applied
                 to the nozzle to obtain the velocity history at the
                 outer face of the nozzle plate. Finally, the free
                 surface shape is calculated using finite-difference
                 methods on the one-dimensional equations for an
                 inviscid incompressible free jet with surface tension
                 that uses the nozzle exit velocity history as the
                 driving boundary condition. The computations are
                 compared with drop formation photographs obtained from
                 a particular nozzle-transducer design. Encouraging
                 agreement is obtained, but the numerical model will
                 require added sophistication before detailed agreement
                 can be expected.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "619; 631; 723",
  corpsource =   "California Univ., Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computer peripheral equipment ---
                 Printers; Computer Simulation; DOD ink-jet; DOD ink-jet
                 nozzles; driving boundary condition; drop; drop
                 formation; drop-in-demand; ejection; experimentation;
                 finite-difference; formation photographs; free surface
                 shape; ink jet printers; integral computation; inviscid
                 compressible flow theory; methods; nozzle-transducer
                 design; nozzles; numerical simulation; pressure;
                 surface tension; viscous momentum; waves",
  subject =      "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
                 Input/Output Devices, Data terminals and printers \\
                 I.6.1 Computing Methodologies, SIMULATION AND MODELING,
                 Simulation Theory, Types of simulation (continuous and
                 discrete) \\ G.1.0 Mathematics of Computing, NUMERICAL
                 ANALYSIS, General, Numerical algorithms",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Pickover:1987:DVR,
  author =       "Clifford A. Pickover",
  title =        "{DNA} Vectorgrams: Representation of Cancer Genes as
                 Movements on a {2D} Cellular Lattice",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "111--119",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A brief introduction to a computer graphics
                 characterization of cancer DNA sequences, as well as
                 other biologically interesting sequences, is presented.
                 The procedure described takes DNA sequences containing
                 n bases and computes n two-dimensional real vectors.
                 When displayed on a planar unit-cellular lattice, these
                 characteristic patterns appear as a `DNA vectorgram,'
                 C(n). Several demonstration plots are provided which
                 indicate that C(n) is sensitive to certain statistical
                 properties of the sequence of bases and allows the
                 human observer to visually detect some important
                 sequence structural properties and patterns not easily
                 captured by traditional methods. The system presented
                 has as its primary focus the fast characterization of
                 the progression of sequence data using an interactive
                 graphics system with several controlling parameters.",
  acknowledgement = ack-nhfb,
  classcodes =   "A8780 (Biophysical instrumentation and techniques);
                 C7330 (Biology and medicine)",
  classification = "723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2D cellular lattice; biological materials --- DNA;
                 biological techniques and instruments; biomedical
                 engineering --- Computer Aided Diagnosis; cancer DNA
                 sequences; cancer genes; cellular biophysics; computer;
                 computer graphics; DNA sequences; DNA vectorgrams;
                 graphics characterization; interactive graphics system;
                 Medical Applications; pattern recognition ---
                 Applications; planar unit-cellular lattice; properties;
                 real vectors; statistical; two-dimensional",
  subject =      "I.3.m Computing Methodologies, COMPUTER GRAPHICS,
                 Miscellaneous \\ J.3 Computer Applications, LIFE AND
                 MEDICAL SCIENCES, Biology",
  treatment =    "A Application",
}

@Article{Franaszek:1987:PHI,
  author =       "P. A. Franaszek",
  title =        "Path Hierarchies in Interconnection Networks",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "1",
  pages =        "120--131",
  month =        jan,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper treats the problem of latency minimization
                 in an interconnection network for a system of N
                 high-performance devices. The networks considered here
                 have data transport separated from control, with the
                 data subnetwork designed so that each network function
                 requires only a single control message, and thus only
                 one contention-resolution delay. For sufficiently large
                 N it is shown that (for an abstract hardware model)
                 minimizing contention delays requires that each message
                 subject to such delays have more than one way of
                 reaching its destination (e.g., via a path hierarchy).
                 The overall approach is discussed in the context of the
                 processor-memory interconnection problem in parallel
                 computing.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5440 (Multiprocessor systems and techniques); C5620
                 (Computer networks and techniques)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer architecture; computer networks; computer
                 systems, digital; contention-resolution delay; control
                 message; data subnetwork; design; high-;
                 interconnection networks; latency minimization; memory
                 interconnection; parallel computing; parallel
                 processing; Parallel Processing; path hierarchy;
                 performance devices; processor-",
  subject =      "C.1.2 Computer Systems Organization, PROCESSOR
                 ARCHITECTURES, Multiple Data Stream Architectures
                 (Multiprocessors), Interconnection architectures",
  treatment =    "P Practical",
}

@Article{Gomory:1987:SI,
  author =       "Ralph E. Gomory",
  title =        "Science in Industry",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "151--153",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The industrial environment contains problems of
                 practical importance. To exploit that environment, an
                 industrial research group must accept the
                 responsibility for forming strong and useful
                 relationships with the rest of the company of which it
                 is a part. Opportunities for contributing to both the
                 industrial and academic worlds stem from the many
                 product-related problems for which existing science
                 offers no solution, but which suggest new scientific
                 directions.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classification = "901; 912; 921",
  conference =   "Math and Comput",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "engineering research; industrial engineering;
                 industrial environment; mathematical techniques;
                 science",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
}

@Article{Goldstine:1987:RED,
  author =       "H. H. Goldstine",
  title =        "Reflections on the Early Days of the Department",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "154--157",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "01A60 (01A74)",
  MRnumber =     "88i:01067",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The paper contains the reminiscences of the founding
                 director of the Mathematical Sciences Department in IBM
                 Research. It is interspersed with a number of anecdotes
                 about his friend and colleague, John von Neumann. It
                 attempts in a short space to recapitulate the history
                 of a distinguished department of mathematics in an
                 industrial environment in an informal and hopefully
                 humorous manner.",
  acknowledgement = ack-nhfb,
  affiliation =  "American Philosophical Society, Philadelphia, PA,
                 USA",
  affiliationaddress = "American Philosophical Society, Philadelphia,
                 PA, USA",
  classification = "912; 921",
  conference =   "Math and Comput",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "industrial engineering; industrial environment;
                 mathematical techniques --- Applications",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
}

@Article{Cohen:1987:AMN,
  author =       "Hirsh Cohen",
  title =        "Applied Mathematics, a National View",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "158--161",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "01A60 (00A69)",
  MRnumber =     "88h:01038",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The development of applied mathematics in the United
                 States during the past forty years is described,
                 including the role of computers and computation in
                 enlarging and changing the field. The growth of the
                 profession is also discussed, along with needs for
                 training and funding for the future.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classification = "722; 921",
  conference =   "Math and Comput",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; applied mathematics; computers ---
                 Applications; mathematical techniques",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
}

@Article{Rivlin:1987:VAT,
  author =       "T. J. Rivlin",
  title =        "A view of approximation theory",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "162--168",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "41-01",
  MRnumber =     "88d:41002",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This is a selective survey of Approximation Theory
                 which touches on the concepts of best approximation,
                 good approximation, approximation of classes of
                 functions, approximation of functionals, and optimal
                 estimation.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B0290F (Interpolation and function approximation);
                 C4130 (Interpolation and function approximation)",
  classification = "921; 922",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Approximation Theory; approximation theory; best
                 approximation; classes; estimation; function
                 approximation; functionals; functions; good
                 approximation; mathematical techniques; optimal;
                 optimal estimation; optimization; selective survey",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Glimm:1987:NAS,
  author =       "J. Glimm and D. H. Sharp",
  title =        "Numerical Analysis and the Scientific Method",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "169--177",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "00A69",
  MRnumber =     "88f:00023",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The computer has given rise to a new mode of
                 scientific practice, and today, computational science
                 stands beside theory and experiment as a fundamental
                 methodology. The impact of the computer revolution on
                 science can be projected from current trends. The
                 demands to be made on computing methodologies will be
                 reviewed. One of the demands is an ongoing need for
                 excellence in computational methodologies. Generic
                 difficulties encountered in meeting these challenges
                 will be discussed. Recent work of the authors and
                 others will be reviewed in this context.",
  acknowledgement = ack-nhfb,
  affiliation =  "New York Univ, New York, NY, USA",
  affiliationaddress = "New York Univ, New York, NY, USA",
  classcodes =   "B0290 (Numerical analysis); C4100 (Numerical
                 analysis)",
  classification = "723; 921",
  conference =   "Math and Comput",
  corpsource =   "Courant Inst. of Math. Sci., New York Univ., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computational science; computer aided analysis;
                 computing methodologies; fundamental; mathematical
                 techniques; methodology; Numerical Analysis; numerical
                 analysis; scientific method",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Odeh:1987:SST,
  author =       "F. Odeh",
  title =        "Some Stability Techniques for Multistep Methods",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "178--186",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65L07 (65-02)",
  MRnumber =     "88i:65094",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A partial survey is given of sundry results in the
                 stability theory of multistep formulae when these are
                 used to integrate time-varying or nonlinear stiff
                 systems, with emphasis on systems arising in circuit
                 analysis.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B1130 (General analysis and synthesis methods)",
  classification = "713; 921",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit analysis; electronic circuits; mathematical
                 techniques --- Nonlinear Equations; methods; multistep;
                 multistep methods; network analysis; nonlinear stiff
                 systems; stability; stability techniques; system
                 stability; Theory; time-varying networks; time-varying
                 systems",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  reviewer =     "David F. Griffiths",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Brayton:1987:FLF,
  author =       "R. K. Brayton",
  title =        "Factoring Logic Functions",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "187--198",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94C10",
  MRnumber =     "88c:94029",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We give a number of methods for obtaining different
                 factored forms for a given logic function. These
                 methods range from purely algebraic ones, which are
                 quite fast, to so-called Boolean ones, which are slower
                 but are capable of giving better results. One of the
                 methods given is both fast and gives good results, and
                 is useful in providing continuous estimates of area and
                 delay as logic synthesis proceeds. In multilevel logic
                 synthesis, each of the methods given has a use in a
                 system where run-time and quality are traded off. We
                 also formulate the problem of optimal algebraic
                 factorization, and pose its solution as a
                 rectangle-covering problem for which a heuristic method
                 is given.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B1265B (Logic circuits); C5210 (Logic design
                 methods)",
  classification = "723; 922",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algebraic factorization; area; Boolean; Boolean
                 Functions; Boolean functions; computer metatheory;
                 continuous; delay; estimates; expression; factored
                 form; factorization; heuristic method; logic design;
                 logic functions; logic synthesis; multilevel logic
                 synthesis; optimal algebraic; optimization;
                 parenthesized algebraic; rectangle-covering problem",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Yashchin:1987:SAT,
  author =       "Emmanuel Yashchin",
  title =        "Some Aspects of the Theory of Statistical Control
                 Schemes",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "199--205",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Control schemes (charts) are widely used in industrial
                 quality control as means of monitoring the quality of
                 manufactured products. These schemes provide a set of
                 criteria for testing whether a given sequence of
                 observations corresponds to an `on-target' state of the
                 production process. In the present work we consider
                 some graphical, computational, and statistical aspects
                 of control charting --- criteria of performance,
                 methods of derivation, analysis, design, etc. We
                 introduce the class of `Markov-type' control schemes
                 and discuss some of its properties.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B0170L (Inspection and quality control)",
  classification = "731; 913; 922",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "charts; control; industrial quality; manufactured
                 products; Markov type control schemes; production
                 process; quality control; schemes; statistical
                 analysis; statistical control schemes; statistical
                 methods; Theory",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Johnson:1987:GPI,
  author =       "Ellis L. Johnson",
  title =        "The group problem and integer programming duality",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "206--212",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90C10 (49A55)",
  MRnumber =     "88c:90096",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Some duality results for integer programming based on
                 subadditive functions are presented first for linear
                 programs and then for the group problem. A similar
                 result for the knapsack problem is given and then a
                 relationship between facets for the group relaxation
                 and facets of the knapsack problem is given. The mixed
                 integer cyclic group problem is then considered and a
                 dual problem given. A common theme is to try to
                 characterize the strongest possible dual problem or
                 equivalently the smallest possible cone of subadditive
                 functions.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B0260 (Optimisation techniques); C1180 (Optimisation
                 techniques)",
  classification = "921",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; cone; cyclic group problem; functions;
                 group; group problem; integer programming; integer
                 programming duality; knapsack problem; linear programs;
                 mathematical programming, linear; relaxation;
                 subadditive",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Auslander:1987:FTR,
  author =       "L. Auslander and M. Shenefelt",
  title =        "{Fourier} Transforms that Respect Crystallographic
                 Symmetries",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "213--223",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "42B10 (20H15 51F15 82A60)",
  MRnumber =     "88h:42014",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In crystallography one has to compute finite Fourier
                 transforms that are often very large and often respect
                 crystallographic symmetries. In this paper we discuss
                 efficient finite Fourier transform algorithms on 5
                 multiplied by 5 multiplied by 5 points that respect a
                 collection of crystallographic symmetries. Although the
                 size is too small for any practical problems, the
                 methods indicated in this paper can be extended to
                 problems of meaningful size.",
  acknowledgement = ack-nhfb,
  affiliation =  "City Univ of New York, New York, NY, USA",
  affiliationaddress = "City Univ of New York, New York, NY, USA",
  classcodes =   "A6150E (Crystal symmetry; models and space groups, and
                 crystalline systems and classes)",
  classification = "482; 531; 804; 921; 933",
  conference =   "Math and Comput",
  corpsource =   "Center for Large Scale Comput., City Univ. of New
                 York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "crystal symmetry; crystallographic symmetries;
                 crystallography; crystals --- Orientation; fast Fourier
                 transforms; finite Fourier; Fourier Transforms;
                 mathematical techniques --- Matrix Algebra;
                 mathematical transformations; transform algorithms;
                 transforms",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  reviewer =     "Marjorie Senechal",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Adler:1987:TD,
  author =       "R. L. Adler",
  title =        "The torus and the disk",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "224--234",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "28D20 (58F08 94A17)",
  MRnumber =     "894 622",
  bibdate =      "Tue Jan 7 07:57:58 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is a survey of a coherent program of
                 mathematics spanning 28 years. It begins with questions
                 concerning classification and structure in ergodic
                 theory and abstract dynamical systems and describes the
                 author's involvement with toral automorphisms,
                 topological entropy, iteration of maps on the interval,
                 symbolic dynamics, and ultimate engineering
                 applications. It serves as a case study of how
                 unplanned-for practical applications can result from
                 the pursuit of mathematics for its own sake.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classification = "723; 921",
  conference =   "Math and Comput",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; codes, symbolic; ergodic theory;
                 mathematical techniques; symbolic dynamics; topological
                 entropy; toral automorphisms",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
}

@Article{Pippenger:1987:CCN,
  author =       "Nicholas Pippenger",
  title =        "The complexity of computations by networks",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "235--243",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94C10 (68Q30 90B10)",
  MRnumber =     "88c:94032",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "653.68016",
  abstract =     "We survey the current state of knowledge concerning
                 the computation of Boolean functions by networks, with
                 particular emphasis on the addition and multiplication
                 of binary numbers. These functions are among the most
                 important of those that networks are commonly used to
                 compute; they also have the merit of illustrating
                 nicely much of the theory of computation by networks.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, San Jose, CA, USA",
  affiliationaddress = "IBM, San Jose, CA, USA",
  classcodes =   "C4230B (Combinatorial switching theory)",
  classification = "721; 723; 921",
  conference =   "Math and Comput",
  corpsource =   "IBM Almaden Res. Center, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "addition; binary numbers; Boolean functions; Boolean
                 Functions; Boolean functions; combinatorial switching;
                 computation; computations by networks; computer
                 metatheory; logic circuits, combinatorial; mathematical
                 techniques --- Polynomials; multiplication; networks",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Coppersmith:1987:C,
  author =       "D. Coppersmith",
  title =        "Cryptography",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "244--248",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A60 (11T71)",
  MRnumber =     "88c:94019",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is concerned with two aspects of
                 cryptography in which the author has been working. One
                 is the Data Encryption Standard (DES), developed at IBM
                 and now in wide use for commercial cryptographic
                 applications. This is a `private key' system; the
                 communicants share a secret key, and the eavesdropper
                 will succeed if he can guess this key among its
                 quadrillions of possibilities. The other is the
                 Diffie--Hellman key exchange protocol, a typical
                 `public key' cryptographic system. Its security is
                 based on the difficulty of taking `discrete logarithms'
                 (reversing the process of exponentiation in a finite
                 field). We describe the system and some analytic
                 attacks against it.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "C6130 (Data handling techniques)",
  classification = "723; 902",
  conference =   "Math and Comput",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cryptography; data encryption standard; Data
                 Encryption Standard; Diffie--Hellman key exchange
                 protocol; discrete logarithms; eavesdropper;
                 exponentiation; IBM; private key; public key; secret
                 key; security; security of data; standards",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "P Practical",
}

@Article{Karp:1987:ERP,
  author =       "Richard M. Karp and Michael O. Rabin",
  title =        "Efficient Randomized Pattern-Matching Algorithms",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "249--260",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68Q20",
  MRnumber =     "89g:68021",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "653.68054",
  abstract =     "We present randomized algorithms to solve the
                 following string-matching problem and some of its
                 generalizations: Given a string X of length n (the
                 pattern) and a string Y (the text), find the first
                 occurrence of X as a consecutive block within Y. The
                 algorithms represent strings of length n by much
                 shorter strings called fingerprints, and achieve their
                 efficiency by manipulating fingerprints instead of
                 longer strings. The algorithms require a constant
                 number of storage locations, and essentially run in
                 real time. They are conceptually simple and easy to
                 implement. The method readily generalizes to
                 higher-dimensional pattern-matching problems.",
  acknowledgement = ack-nhfb,
  affiliation =  "Univ of California, Berkeley, CA, USA",
  affiliationaddress = "Univ of California, Berkeley, CA, USA",
  classcodes =   "C6130D (Document processing techniques)",
  classification = "723; 921",
  conference =   "Math and Comput",
  corpsource =   "California Univ., Berkeley, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Algorithms; computer programming; computerised pattern
                 recognition; consecutive block; fingerprint functions;
                 fingerprints; mathematical techniques --- Algorithms;
                 pattern recognition; pattern-matching; problem;
                 randomized pattern-matching algorithms; storage
                 locations; string-matching; word processing",
  meetingaddress = "Yorktown Heights, NY, USA",
  meetingdate =  "Dec 1985",
  meetingdate2 = "12/85",
  treatment =    "P Practical",
}

@Article{Agarwal:1987:CNS,
  author =       "Ramesh C. Agarwal and James W. Cooley and Fred G.
                 Gustavson and James B. Shearer and Gordon Slishman and
                 Bryant Tuckerman",
  title =        "Clarification: {``New scalar and vector elementary
                 functions for the IBM System/370''} [{IBM J. Res.
                 Develop. {\bf 30} (1986), no. 2, 126--144}]",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "2",
  pages =        "274--274",
  month =        mar,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "76W05",
  MRnumber =     "894 626",
  bibdate =      "Mon Feb 12 08:07:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Agarwal:1986:NSV}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wolfe:1987:SMP,
  author =       "Robert N. Wolfe and Michael A. Wesley and James C.
                 {Kyle, Jr.} and Franklin Gracer and William J.
                 Fitzgerald",
  title =        "Solid Modeling for Production Design",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "277--295",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a solid modeling and interactive
                 graphics computer system which is being used for
                 conceptual and design. Its development has resulted in
                 one of the first major production uses of solid
                 modeling in industry. The system was first tested in
                 pilot and limited production environments in 1981, and
                 is now in production use as the primary design tool for
                 mechanical portions of IBM's large computer mainframes.
                 Its introduction, development, integration, and use are
                 described and its functional and performance
                 characteristics as well as requirements for future
                 enhancements are discussed. (Edited author abstract)",
  acknowledgement = ack-nhfb,
  classcodes =   "C5420 (Mainframes and minicomputers); C7430 (Computer
                 engineering)",
  classification = "722; 723; 913",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "CAD; Computer Applications; computer graphics;
                 computer graphics --- Interactive; computer mainframes;
                 computer system; Data Systems; design; Division
                 Laboratory; future enhancements; IBM computers;
                 interactive graphics; mainframes; mechanical design
                 community; primary design tool; product design;
                 production design; production engineering --- Computer
                 Applications; production tool; solid modeling",
  subject =      "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
                 \\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations",
  treatment =    "P Practical",
}

@Article{Rossignac:1987:PCG,
  author =       "Jaroslaw R. Rossignac and Aristides A. G. Requicha",
  title =        "Piecewise-Circular Curves for Geometric Modeling",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "296--313",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "00A71 (65D10)",
  MRnumber =     "88h:00015",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Modern solid modelers must be able to represent a wide
                 class of objects, and must support Boolean operations
                 on solids. These operations are useful for defining
                 solids, detecting interferences and modeling
                 fabrication processes. Computing the boundaries of
                 solids defined through Boolean operations requires
                 algorithms for surface\slash surface and curve\slash
                 surface intersection. Cubic splines exhibit
                 second-degree continuity, but they are expensive to
                 process in solid modeling computations. We trade
                 second-degree continuity for computational simplicity,
                 and present a method for interpolating
                 three-dimensional points and associated unit tangent
                 vectors by smooth space curves composed of straight
                 line segments and circular arcs. These curves are
                 designated as PCCs (piecewise-circular curves) and have
                 continuous unit tangents. PCCs can be used in efficient
                 algorithms for performing fundamental geometric
                 computations, such as the evaluation of the minimal
                 distance from a point to a cure or the intersection of
                 a cure and a surface. Formulae and algorithms are
                 presented for generating and processing PCCs in solid
                 modelers.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7400 (Engineering)",
  classification = "722; 723; 913; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; blending; CAD; circular arcs;
                 computations; computer graphics; computer programming
                 --- Algorithms; cones; continuous unit tangents; cubic
                 splines; curves; cylinders; fundamental geometric;
                 geometric modeling; Geometry; growing; mathematical
                 techniques; minimal distance; natural; PCCs;
                 piecewise-circular curves; piecewise-linear techniques;
                 planes; primitives; quadratic surfaces; shrinking;
                 smooth space; solid modelers; spheres; straight line
                 segments; sweeping; theory; three-dimensional points;
                 toroidal; unit tangent vectors",
  subject =      "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations \\ I.3.5
                 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Geometric
                 algorithms, languages, and systems \\ G.1.1 Mathematics
                 of Computing, NUMERICAL ANALYSIS, Interpolation",
  treatment =    "P Practical",
}

@Article{Farouki:1987:TAE,
  author =       "Rida T. Farouki",
  title =        "Trimmed-Surface Algorithms for the Evaluation and
                 Interrogation of Solid Boundary Representation",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "314--334",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Although trimmed surfaces play a fundamental role in
                 the deviation and processing of solid boundary
                 representations, they have received little attention to
                 date. We propose a trimmed-surface formulation
                 appropriate to the Boolean combination of primitive
                 bounded by a family of elementary surface patches
                 (e.g., planes, quadrics, ruled surfaces, surfaces of
                 revolution) with dual parametric rational polynomial
                 and implicitly algebraic equations. Partial
                 intersections between pairs of primitive surface
                 patches are formulated precisely as algebraic curves in
                 the parameter space of ech patch. These curves are
                 dissected into monotonic branches by the identification
                 of a characteristic point set. The consolidation of all
                 partial intersections yields a system of
                 piecewise-algebraic loops which define a trimming
                 boundary enclosing a parametric domain for the trimmed
                 patch. With few exceptions, the trimmed-surface
                 formulation is based on precisely defined mathematical
                 procedures, in order to achieve maximum robustness.
                 Some basic interrogation algorithms for solids bounded
                 by trimmed-surface elements are also presented.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7400 (Engineering)",
  classification = "722; 723; 913; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algebraic curves; algebraic equations; algorithms;
                 Boolean combination; CAD; center of; characteristic;
                 computer graphics; computer programming --- Algorithms;
                 dual parametric rational polynomial; elementary
                 surface; evaluation; Geometry; gravity; implicit;
                 interrogation; mathematical techniques; modelling;
                 moments of inertia; monotonic branches; patches;
                 piecewise-algebraic loops; piecewise-linear techniques;
                 point set; point/solid classification; primitives;
                 ray-tracing; solid boundary representations; surface
                 area; theory; trimmed surfaces; trimmed-surface
                 algorithms; volume",
  subject =      "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations \\ G.1.5
                 Mathematics of Computing, NUMERICAL ANALYSIS, Roots of
                 Nonlinear Equations, Polynomials, methods for",
  treatment =    "P Practical",
  xxtitle =      "Trimmed-surface algorithms for the evaluation and
                 interrogation of solid boundary representations",
}

@Article{OConnor:1987:SUV,
  author =       "Michael A. O'Connor and Graziano Gentili",
  title =        "Simple Unit Vectors Orthogonal to a Given Vector",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "335--342",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "11Y16 (15A03 65F30)",
  MRnumber =     "88j:11088",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "653.68022",
  abstract =     "In geometrical computations it is often necessary to
                 find two unit vectors such that they and a given vector
                 form an orthogonal basis. Computationally simple forms
                 for the two unit vectors are useful. We show that they
                 cannot always be chosen to have rational coordinates,
                 but that in general the simplest possible vectors can
                 be chosen to involve only one square root. We develop
                 number-theoretic criteria for the existence of a
                 rational vector and an effective algorithm for
                 calculation of one if it exists. We also discuss
                 storage and time requirements of the algorithm.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods)",
  classification = "723; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; computational geometry; computer graphics;
                 computer programming --- Algorithms; geometrical
                 computations; mathematical techniques; number theory;
                 one square root; orthogonal basis; rational vector;
                 theory; unit vectors; vectors; Vectors; verification",
  reviewer =     "J. L. Brenner",
  subject =      "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
                 AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Geometrical problems and computations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous \\ F.2.1 Theory of Computation, ANALYSIS
                 OF ALGORITHMS AND PROBLEM COMPLEXITY, Numerical
                 Algorithms and Problems, Number-theoretic
                 computations",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Evans:1987:SGO,
  author =       "Roger C. Evans and George Koppelman and V. T. Rajan",
  title =        "Shaping geometric objects by cumulative translational
                 sweeps",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "343--360",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper introduces the cumulative translational
                 sweep (CTS) as a tool for shaping geometric objects. It
                 describes how it may be applied, in combination with
                 Boolean operations, to stimulate growth and shrinking
                 over the boundary regions of polyhedral models, and
                 how, by creating additional facets, it may be used to
                 achieve global rounding effects long model edges and
                 around their vertices. CTSs are examined in terms of
                 conceptual framework that describes their effects as
                 Minkowski sums --- of the polyhedra to be swept, with
                 convex polyhedra from the class of mathematical objects
                 known as zonotopes. Included is a discussion of
                 applications in the OYSTER program, a CAD system for
                 the simulation of semiconductor wafer fabrication.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7410D (Electronic engineering)",
  classification = "713; 714; 723; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boolean operations; Boolean operations; boundary
                 regions; CAD system; circuit CAD; computational
                 geometry; Computer Aided Design; computer graphics;
                 convex polyhedra; cumulative translational sweeps;
                 design; geometric objects; global rounding effects;
                 growth; integrated circuit manufacture; mathematical
                 techniques --- Geometry; Minkowski sums; model edges;
                 OYSTER program; polyhedral models; semiconductor;
                 semiconductor wafer; semiconductor wafer fabrication;
                 shaping; shrinking; technology; theory; translational
                 sweeps; vertices; zonotopes",
  subject =      "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Geometric
                 algorithms, languages, and systems \\ J.6 Computer
                 Applications, COMPUTER-AIDED ENGINEERING \\ C.4
                 Computer Systems Organization, PERFORMANCE OF SYSTEMS,
                 Modeling techniques",
  treatment =    "P Practical",
  xxtitle =      "Shaping Geometric Objects by Cumulative Translational
                 Sweep",
}

@Article{Srinivasan:1987:VDM,
  author =       "Vijay Srinivasan and Lee R. Nackman",
  title =        "{Voronoi} Diagram for Multiply-Connected Polygonal
                 Domains. {I}: Algorithm",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "361--372",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68U05 (11H99 51-04)",
  MRnumber =     "906 140",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Voronoi diagrams of multiple-connected polygonal
                 domains (polygons with holes) can be of use in
                 computer-aided design. We describe a simple algorithm
                 that computes such Voronoi diagrams in O(N(log$_2$) N
                 plus H) time, where N is the number of edges and H is
                 the number of holes.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1160 (Combinatorial mathematics)",
  classification = "723; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; CAD; computational geometry; computer
                 graphics; computer programming --- Algorithms;
                 computer-aided design; design; edges; Geometry; holes;
                 mathematical techniques; multiply-connected polygonal
                 domains; polygonal domains; theory; verification;
                 Voronoi diagram; Voronoi diagrams",
  subject =      "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
                 AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Geometrical problems and computations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Meshkat:1987:VDM,
  author =       "Siavash N. Meshkat and Constantine M. Sakkas",
  title =        "{Voronoi} Diagram for Multiply-Connected Polygonal
                 Domains. {II}: Implementation and Application",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "373--381",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68U05 (11H99 51-04)",
  MRnumber =     "906 141",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Voronoi diagrams have many novel applications in
                 computer-aided design. An implementation of a Voronoi
                 diagram algorithm described in a companion paper by
                 Srinivasan and Nackman is presented. This Voronoi
                 diagram is then used for an application in which
                 equivalent resistance networks are derived from a
                 boundary representation of a two-dimensional VLSI
                 geometry.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); C7410D
                 (Electronic engineering)",
  classification = "703; 713; 714; 723; 921",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithm; boundary representation; circuit CAD;
                 computational geometry; Computer Aided Design; computer
                 graphics; computer-aided design; design; dimensional
                 VLSI geometry; electric networks, active --- Computer
                 Aided Design; equivalent resistance networks;
                 integrated circuits, VLSI; mathematical techniques ---
                 Geometry; polygonal domains; resistance networks;
                 theory; two-; two-dimensional VLSI geometry; VLSI;
                 Voronoi diagram; Voronoi diagram, polygonal domains,
                 resistance networks, two-dimensional VLSI geometry,
                 boundary representation; Voronoi diagrams",
  subject =      "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
                 AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Geometrical problems and computations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous \\ I.1.2 Computing Methodologies,
                 ALGEBRAIC MANIPULATION, Algorithms, Analysis of
                 algorithms",
  treatment =    "P Practical",
}

@Article{Hood:1987:AAI,
  author =       "Sarah J. Hood and Ronald C. Rosenberg and David H.
                 Wither and Tong Zhou",
  title =        "An algorithm for automatic identification of
                 {R}-fields in bond graphs",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "382--390",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Bond graphs may be used to model the power flow in
                 dynamic systems. They are especially attractive for
                 modeling systems which function in coupled energy
                 domains, for example, electromechanical systems. For
                 such systems, bond graphs can be used to provide a
                 natural subdivision into power\slash energy fields:
                 storage, sources, transformers, and dissipation, In
                 nonlinear dissipative fields, implicit, nonlinear,
                 coupled systems of algebraic equations may arise.
                 Causality assignment of the bond graph provides a basis
                 for detecting implicitly formulations. This paper
                 presents an algorithm for detection and solution of
                 these forms within a model, thereby providing an
                 opportunity for efficient numerical solutions, and
                 includes an introduction into bond graphs via an
                 electromechanical system example.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0250 (Combinatorial mathematics); B0290K (Nonlinear
                 and functional equations); C1160 (Combinatorial
                 mathematics); C4150 (Nonlinear and functional
                 equations)",
  classification = "723; 731; 921",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; automatic identification; bond graphs;
                 causality; computer programming --- Algorithms; control
                 systems --- Identification; coupled energy domains;
                 dissipation; dynamic systems; efficient;
                 electromechanical system; electromechanical systems;
                 Graph Theory; graph theory; mathematical techniques;
                 nonlinear dissipative fields; nonlinear equations;
                 numerical solution; power flow; R-fields; r-fields;
                 sources; storage; theory; transformers",
  subject =      "G.1.5 Mathematics of Computing, NUMERICAL ANALYSIS,
                 Roots of Nonlinear Equations, Systems of equations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Darema:1987:PAC,
  author =       "Frederica Darema and Scott Kirkpatrick and V. A.
                 Norton",
  title =        "Parallel Algorithms for Chip Placement by Simulated
                 Annealing",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "3",
  pages =        "391--402",
  month =        may,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We explore modifications to the standard simulated
                 annealing method for circuit placement which make it
                 more suitable for use on a shared-memory parallel
                 computer. By employing chaotic approaches we allow the
                 parallel algorithms to deviate from the algorithm
                 defined for a serial computer and thus obtain good
                 execution efficiencies for large numbers of processors.
                 The qualitative behavior of the parallel algorithms is
                 comparable to that of the serial algorithm.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 C7410D (Electronic engineering)",
  classification = "713; 714; 722; 723",
  corpsource =   "IBM Thomas Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; chaotic approaches; chip placement;
                 circuit layout CAD; circuit placement; computer;
                 computer programming --- Algorithms; computer systems,
                 digital; design; execution efficiencies; integrated
                 circuits --- Computer Aided Design; measurement;
                 parallel algorithms; Parallel Processing; performance;
                 qualitative behavior; shared-memory parallel; simulated
                 annealing; theory",
  subject =      "G.1.0 Mathematics of Computing, NUMERICAL ANALYSIS,
                 General, Parallel algorithms \\ F.1.2 Theory of
                 Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
                 Computation, Parallelism \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS \\ B.7.2 Hardware,
                 INTEGRATED CIRCUITS, Design Aids, Placement and
                 routing",
  treatment =    "P Practical",
}

@Article{Wakefield:1987:REP,
  author =       "Scott P. Wakefield and Michael J. Flynn",
  title =        "Reducing Execution Parameters Through Correspondence
                 in Computer Architecture",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "420--434",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This study develops and extends techniques to provide
                 architectural correspondence between high-level
                 language objects and hardware resources to minimize
                 execution time parameters (memory traffic, program
                 size, etc.). A resulting computer instruction set
                 called Adept has been emulated, and a compiler has been
                 developed with it as the target language. Although the
                 study was restricted to Pascal, the resulting data are
                 generally applicable to the execution time environment
                 of any procedure-based language. Data indicate that
                 significant bandwidth reductions are possible compared
                 to System\slash 370, VAX, P-code, etc. The average
                 improvement ratios realized were instruction bandwidth
                 reduction: 3.46; data read reduction (in bytes): 5.42;
                 data write reduction (in bytes): 14.72.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4240 (Programming and algorithm theory); C5220
                 (Computer architecture); C6140D (High level
                 languages)",
  classification = "722; 723",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Adept; architectural; architectural correspondence;
                 bandwidth reduction; based language; compiler;
                 computational complexity; computer architecture;
                 computer instruction set; computer performance;
                 computer programming languages; correspondence; data
                 read reduction; data write reduction; design; execution
                 parameters; execution time; execution time environment;
                 hardware; high-level language; high-level language
                 objects; instruction; instruction set; measurement;
                 memory; minimize execution time parameters; Pascal;
                 Performance; performance; procedure-; program size;
                 resources; sets; traffic",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS",
  treatment =    "A Application; X Experimental",
}

@Article{Cvetanovic:1987:PAF,
  author =       "Zark Cvetanovic",
  title =        "Performance Analysis of the {FFT} Algorithm on a
                 Shared-Memory Parallel Architecture",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "435--451",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a model for the performance
                 prediction of FFT algorithms executed on a
                 shared-memory parallel computer consisting of N
                 processors and the same number of memory modules. The
                 model applies a deterministic analysis to estimate the
                 communication delay through the interconnection network
                 by assuming that all requests arrive at the network in
                 bursts. Our results indicate that the communication
                 delay is affected by the method applied to allocate
                 data to memory modules. For the case in which all data
                 items referenced by a processor during an iteration are
                 allocated to a single memory module, the best-case
                 communication time complexity grows as O left bracket
                 (logN)**2/N right bracket. The worst-case communication
                 time complexity for this case, obtained by a different
                 allocation of data to memory modules, is increased to O
                 left bracket (logN)/ ROOT N right bracket due to high
                 network contention.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods); C4230 (Switching
                 theory); C4240 (Programming and algorithm theory);
                 C5220 (Computer architecture); C5470 (Performance
                 evaluation and testing)",
  classification = "722; 723; 921",
  corpsource =   "Digital Equipment Corp., Boxborough, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; architecture; best-case; bursts;
                 communication; communication delay; communication time;
                 computational complexity; computer architecture;
                 computer programming --- Algorithms; data storage,
                 digital; design; deterministic analysis; fast Fourier
                 transforms; FFT algorithm; interconnection network;
                 iterative; mathematical transformations --- Fast
                 Fourier Transforms; measurement; memory modules;
                 methods; model; multiprocessor interconnection
                 networks; network contention; number of; parallel;
                 parallel architecture; parallel architectures;
                 performance; Performance; performance analysis;
                 performance evaluation; performance prediction;
                 shared-memory; shared-memory parallel; theory; time
                 complexity; worst-case",
  subject =      "F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Modes of Computation, Parallelism \\ C.1.3
                 Computer Systems Organization, PROCESSOR ARCHITECTURES,
                 Other Architecture Styles \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS \\ F.2.1 Theory of
                 Computation, ANALYSIS OF ALGORITHMS AND PROBLEM
                 COMPLEXITY, Numerical Algorithms and Problems,
                 Computation of transforms",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Cvetanovic:1987:BWM,
  author =       "Zarka Cvetanovic",
  title =        "Best and Worst Mappings for the Omega Network",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "452--463",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents a study of the best and worst
                 mappings for the omega network proposed by D. H. Lawrie
                 in 1975. We identify mappings that produce no conflicts
                 in the network and mappings that produce a maximum
                 number of conflicts. The analysis of mappings for some
                 typical applications shows that an initial allocation
                 of data to memory modules determines the contention
                 within the network for all iterations of the algorithm.
                 For the case of the FFT and the bitonic sort algorithm
                 executed on a shared-memory architecture, we prove that
                 if no conflicts are produced during the first iteration
                 of the algorithm, then no conflicts are produced during
                 any other iteration. If a maximum number of conflicts
                 are produced during the first iteration, then a maximum
                 number of conflicts are produced during all other
                 iterations of the algorithm. For the d-dimensional grid
                 computations where communication is required with 2d
                 nearest neighbors, we prove that if the initial
                 allocation produces no conflicts within the network,
                 then communication with all the neighbors is
                 conflict-free. If the initial allocation produces a
                 maximum number of conflicts, then communication with
                 all the neighbors is maximum-conflict.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4190 (Other numerical methods); C4230 (Switching
                 theory); C4240 (Programming and algorithm theory);
                 C5220 (Computer architecture); C5470 (Performance
                 evaluation and testing); C6130 (Data handling
                 techniques)",
  classification = "721; 722; 723",
  corpsource =   "Digital Equipment Corp., Boxborough, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Analysis; best mappings; bit reversal;
                 bit-permute mappings; bitonic sort algorithm;
                 computational complexity; computer architecture;
                 computer networks; computer programming --- Algorithms;
                 conflicts; d-dimensional grid computations; design;
                 fast Fourier transforms; FFT; initial allocation of
                 data; mappings; mappings that produce no conflicts;
                 measurement; memory contention; memory modules;
                 multiprocessor interconnection networks; network
                 contention; omega network; parallel; parallel
                 architectures; perfect shuffle; performance;
                 shared-memory architecture; sorting; switching theory;
                 verification; worst",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ C.1.2 Computer Systems Organization,
                 PROCESSOR ARCHITECTURES, Multiple Data Stream
                 Architectures (Multiprocessors), Interconnection
                 architectures",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Stone:1987:EST,
  author =       "Harold S. Stone and Janice M. Stone",
  title =        "Efficient Search Techniques --- an Empirical Study of
                 the {N-Queens} Problem",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "464--474",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper investigates the cost of finding the first
                 solution to the N-Queens Problem using various
                 backtrack search strategies. Among the empirical
                 results obtained are the following: (1) To find the
                 first solution to the N-Queens Problem using
                 lexicographic backtracking requires a time that grows
                 exponentially with increasing values of N. (2) For most
                 even values of N less than 30, search time can be
                 reduced by a factor from 2 to 70 by searching
                 lexicographically for a solution to the N plus 1-Queens
                 Problem. (3) By reordering the search so that the queen
                 placed next is the queen with the fewest possible moves
                 to make, it is possible to find solutions quickly for
                 all N less than 97, improving running time by dozens of
                 orders of magnitude over lexicographic backtrack
                 search. To estimate the improvement, we present an
                 algorithm that is a variant of algorithms of Knuth and
                 Purdom for estimating the size of the unvisited portion
                 of a tree from the statistics of the visited portion.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1230 (Artificial intelligence); C4240 (Programming
                 and algorithm theory)",
  classification = "723; 921; 922",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; artificial intelligence; backtrack;
                 backtracking; computational complexity; computer
                 metatheory; design; efficient search techniques;
                 empirical results; empirical study; exponential time;
                 first solution; lexicographic; mathematical techniques;
                 N-Queens Problem; n-queens problem; orders of magnitude
                 improvement; performance; probability --- Game Theory;
                 search rearrangement; search strategies; search trees;
                 theory; Trees; unvisited portion; visited portion",
  subject =      "I.2.8 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Problem Solving, Control Methods, and
                 Search, Backtracking \\ F.2.2 Theory of Computation,
                 ANALYSIS OF ALGORITHMS AND PROBLEM COMPLEXITY,
                 Nonnumerical Algorithms and Problems, Sorting and
                 searching",
  treatment =    "X Experimental",
}

@Article{Sitaram:1987:IIM,
  author =       "Dinkar Sitaram",
  title =        "The inconsistency index method for estimating the
                 accuracy of {Schweitzer}'s approximation",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "475--483",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B22",
  MRnumber =     "88i:90095",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Product-form queueing networks have proved to be
                 useful for predicting the performance of computer
                 systems. In practice, these networks are analyzed using
                 approximate methods because exact methods are
                 computationally too expensive. Schweitzer's
                 approximation is one of the most commonly used.
                 However, there is no method for estimating the error in
                 the solution. This paper proposes a new approach for
                 estimating the error in Schweitzer's approximation for
                 fixed-rate product-form networks. It is based on
                 detecting the extent to which the approximation
                 assumptions used hold. Empirical evidence is presented
                 to show that this approach can be used to accurately
                 predict the error in the approximation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B0250 (Combinatorial
                 mathematics); B0290B (Error analysis in numerical
                 methods); C1140C (Queueing theory); C1160
                 (Combinatorial mathematics); C4110 (Error analysis in
                 numerical methods)",
  classification = "722; 723; 921; 922",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Analysis; approximation assumptions; approximation
                 error; computer systems, digital; design; empirical
                 evidence; error analysis; error estimation; fixed-;
                 graph theory; inconsistency index; mathematical
                 techniques --- Approximation Theory; measurement;
                 method; performance; probability --- Queueing Theory;
                 product-form networks; queueing networks; queueing
                 theory; rate product-form networks; Schweitzer's
                 approximation; theory",
  subject =      "G.m Mathematics of Computing, MISCELLANEOUS, Queueing
                 theory \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Takagi:1987:EAR,
  author =       "Hideaki Takagi",
  title =        "Exact Analysis of Round-Robin Scheduling of Services",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "484--488",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "90B35 (90B15)",
  MRnumber =     "88k:90100",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A multi-queue, cyclic-service model with a
                 single-message buffer is considered. Each message
                 consists of a number of characters, and one character
                 is served at the server's each visit. Exact and
                 explicit expressions are derived for performance
                 measures, such as mean cycle time, mean message
                 response time, and mean response time conditioned on
                 the message length.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0240C (Queueing theory); B6150 (Communication system
                 theory)C1140C (Queueing theory); C5470 (Performance
                 evaluation and testing); C6150J (Operating systems)",
  classification = "723; 921; 922",
  corpsource =   "IBM Japan Ltd., Tokyo Res. Lab., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer metatheory; cyclic-service model; design;
                 exact analysis; explicit expressions; mathematical
                 techniques; mean cycle time; mean message response
                 time; mean response time conditioned; measurement;
                 multi queue model; on message length; performance;
                 performance evaluation; performance measures;
                 probability; queueing theory; Queueing Theory;
                 round-robin scheduling; round-robin scheduling of;
                 scheduling; services; single-message buffer; theory",
  subject =      "F.2.2 Theory of Computation, ANALYSIS OF ALGORITHMS
                 AND PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Sequencing and scheduling \\ C.4 Computer
                 Systems Organization, PERFORMANCE OF SYSTEMS \\ G.m
                 Mathematics of Computing, MISCELLANEOUS, Queueing
                 theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Huang:1987:SDT,
  author =       "Ching-Chao Huang and Leon L. Wu",
  title =        "Signal Degradation Through Module Pins in {VLSI}
                 Packaging",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "4",
  pages =        "489--498",
  month =        jul,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper investigates chip-to-chip communication
                 through the modules and board in VLSI packaging.
                 Transmission line models and frequency-dependent
                 transmission line parameters are used in finding the
                 frequency response. The time-domain solution is then
                 obtained through the inverse Fast Fourier Transform.
                 The results show that uncoated module pins, even of
                 relatively short length, can cause severe signal
                 degradation because of their magnetic property. The
                 signal behavior is improved dramatically, when the
                 module pins are coated with nonmagnetic conductive
                 material.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170J (Product packaging); B2570 (Semiconductor
                 integrated circuits)",
  classification = "421; 713; 714",
  corpsource =   "IBM Gen. Technol. Div., East Fishkill Facility,
                 Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "chip-to-chip communication; conductive; dependent
                 transmission line parameters; design; Electronics
                 Packaging; frequency response; frequency-; integrated
                 circuit chips; integrated circuit manufacture ---
                 Thermal Effects; integrated circuits, VLSI; inverse
                 Fast Fourier Transform; magnetic pins; magnetic
                 property; measurement; module pins; nonmagnetic
                 coating; nonmagnetic conductive material; nonmagnetic
                 pins; packaging; performance; pin inductance; signal
                 behavior; signal degradation; theory; time-domain
                 solution; transmission line modules; uncoated module
                 pins; VLSI; VLSI packaging",
  subject =      "C.5.4 Computer Systems Organization, COMPUTER SYSTEM
                 IMPLEMENTATION, VLSI Systems \\ B.7.1 Hardware,
                 INTEGRATED CIRCUITS, Types and Design Styles, VLSI
                 (very large scale integration) \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical; X Experimental",
}

@Article{Astesiano:1987:DSC,
  author =       "Egidio Astesiano and Gianna Reggio",
  title =        "Direct semantics of concurrent languages in the
                 {SM}o{LCS} approach",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "512--534",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "For years providing syntax-directed methods for the
                 formal definition of concurrent languages has proved to
                 be a challenging task. Problems are even more difficult
                 if a language has some of the typical Ada features,
                 such as strong interference between sequential and
                 concurrent aspects, parameterized semantics, complex
                 data structure, and an extremely large size. We have
                 developed an approach, the SMoLCS approach, which
                 extends the denotational method to handle concurrent
                 languages and provides a solution to the above
                 problems. Our method has been adopted for the formal
                 definition of full Ada within the related EEC project.
                 We illustrate the basic principles of the approach,
                 following the so-called direct semantics style used for
                 Ada with the help of a toy language as a running
                 example.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C6140D (High level languages);
                 C6150C (Compilers, interpreters and other processors)",
  classification = "721; 723",
  corpsource =   "Dept. of Math., Genoa Univ., Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Ada; automata theory --- Computational Linguistics;
                 computer programming languages; concurrent languages;
                 definition of full Ada; denotational method; design;
                 direct semantics; EEC project; example; formal; formal
                 definition; high level languages; languages; methods;
                 parallel programming; Performance; semantics; SMoLCS
                 approach; syntax-directed; syntax-directed methods;
                 theory; toy language",
  subject =      "D.4.1 Software, OPERATING SYSTEMS, Process Management,
                 Concurrency \\ D.3.3 Software, PROGRAMMING LANGUAGES,
                 Language Constructs, Concurrent programming structures
                 \\ D.3.1 Software, PROGRAMMING LANGUAGES, Formal
                 Definitions and Theory, Semantics \\ D.3.2 Software,
                 PROGRAMMING LANGUAGES, Language Classifications \\
                 F.3.2 Theory of Computation, LOGICS AND MEANINGS OF
                 PROGRAMS, Semantics of Programming Languages,
                 Denotational semantics",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical",
}

@Article{Woodcock:1987:TPP,
  author =       "J. C. P. Woodcock",
  title =        "Transaction Processing Primitives and {CSP}",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "535--545",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Several primitives for transaction processing systems
                 are developed using the notations of Communicating
                 Sequential Processes. The approach taken is to capture
                 each requirement separately, in the simplest possible
                 context: The specification is then the conjunction of
                 all these requirements. As each is developed as a
                 predicate over traces of the observable events in the
                 system, it is also implemented as a simple
                 communicating process; the implementation of the entire
                 system is then merely the parallel composition of these
                 processes. The laws of CSP are then used to transform
                 the system to achieve the required degree of
                 concurrency, to make it suitable for execution in a
                 multiple-tasking system, for example. There is a
                 discussion of how state-based systems may be developed
                 using this approach together with some appropriate
                 notation for specifying and refining data structures
                 and operations upon them and of how the system may be
                 implemented. This work is intended as a case study in
                 the use of CSP.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C6150J (Operating
                 systems)",
  classification = "721; 731",
  corpsource =   "Comput. Lab., Oxford Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automata theory; case study; Communicating Sequential;
                 communicating sequential processes; computer
                 metatheory; computer programming; concurrency; data
                 structures; design; multiple-tasking system;
                 multiprogramming; parallel composition; primitives and
                 CSP; Processes; state-based; systems; theory;
                 transaction processing; transaction processing
                 primitives; transaction processing systems",
  subject =      "D.1.3 Software, PROGRAMMING TECHNIQUES, Concurrent
                 Programming, CSP \\ F.3.3 Theory of Computation, LOGICS
                 AND MEANINGS OF PROGRAMS, Studies of Program
                 Constructs, Control primitives \\ H.2.4 Information
                 Systems, DATABASE MANAGEMENT, Systems, Transaction
                 processing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Morgan:1987:SSR,
  author =       "Carroll Morgan and Ken Robinson",
  title =        "Specification Statements and Refinement",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "546--555",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68N05",
  MRnumber =     "922 164",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We discuss the development of executable programs from
                 state-based specifications written in the language of
                 first-order predicate calculus. Notable examples of
                 such specifications are those written using the
                 techniques Z and VDM; but our interest is in the
                 derivation of the algorithms from which they
                 deliberately abstract. This is, the role of a
                 development method. We propose a development method
                 based on specification statements with which
                 specifications are embedded in programs --- standing in
                 for developments `yet to be done.' We show that
                 specification statements allow description,
                 development, and execution to be carried out within a
                 single language: programs\slash specifications become
                 hybrid constructions in which both predicates and
                 directly executable operations can appear. The use of a
                 single language --- embracing both high-and low-level
                 constructs --- has a considerable influence on the
                 development style, and it is that influence we discuss:
                 the specification statement is described, its
                 associated calculus of refinement is given, and the use
                 of that calculus is illustrated.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6110 (Systems analysis and programming)",
  classification = "723",
  corpsource =   "Comput. Lab., Oxford Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Algorithms; associated; calculus of
                 refinement; computer metatheory; computer programming;
                 design; development method; development of executable
                 programs; examples; executable programs; hybrid
                 constructions; language of first-order predicate
                 calculus; languages; predicate calculus;
                 programs/specifications; rigorous derivation; single
                 language; software engineering; specification
                 statements; specifications; state-based; state-based
                 specifications; theory; VDM; verification; Z",
  subject =      "F.3.1 Theory of Computation, LOGICS AND MEANINGS OF
                 PROGRAMS, Specifying and Verifying and Reasoning about
                 Programs \\ D.3.1 Software, PROGRAMMING LANGUAGES,
                 Formal Definitions and Theory \\ D.2.1 Software,
                 SOFTWARE ENGINEERING, Requirements/Specifications",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Smolka:1987:CSN,
  author =       "Scott A. Smolka and Robert E. Strom",
  title =        "A {CCS} semantics for {NIL}",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "556--570",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We present a syntax-directed translation of NIL, a
                 high-level language for distributed systems
                 programming, into CCS, Milner's Calculus of
                 Communicating Systems. This translation presents unique
                 problems because of NIL's highly dynamic nature, and
                 makes full use of CCS's descriptive facilities. We
                 consider NIL constructs for dynamic creation and
                 deletion of processes and communication channels,
                 queued synchronous and asynchronous message passing,
                 nondeterministic message selection, and exception
                 handling. A NIL implementation of a simple command
                 shell is used to illustrate the translation procedure.
                 We discuss various issues and open problems concerning
                 the suitability of CCS as an abstract semantics for
                 NIL.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6150J (Operating
                 systems)",
  classification = "721; 723",
  corpsource =   "Dept. of Comput. Sci., State Univ. of New York, Stony
                 Brook, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abstract; automata theory; Calculus of; CCS semantics;
                 Communicating Systems; compilers; computer operating
                 systems --- Program Translators; computer programming
                 languages; design; distributed processing; distributed
                 systems programming; high level languages; high-;
                 high-level language; languages; level language; message
                 passing; nil constructs; program; semantics;
                 syntax-directed translation; syntax-directed
                 translation of NIL; theory; translation procedure",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, NIL \\ D.2.1 Software, SOFTWARE
                 ENGINEERING, Requirements/Specifications, CCS \\ F.4.3
                 Theory of Computation, MATHEMATICAL LOGIC AND FORMAL
                 LANGUAGES, Formal Languages, CCS \\ F.3.2 Theory of
                 Computation, LOGICS AND MEANINGS OF PROGRAMS, Semantics
                 of Programming Languages",
  treatment =    "G General Review",
}

@Article{Ciskowski:1987:SIE,
  author =       "R. D. Ciskowski and C. H. Liu and H. H. Ottesen and S.
                 U. Rahman",
  title =        "System Identification: an Experimental Verification",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "571--584",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "System Identification may be defined as the process of
                 determining a model of a dynamic system using observed
                 system input-output data. The identification of dynamic
                 systems through the use of experimental data is
                 important in engineering since it provides information
                 about system parameters which is useful in predicting
                 behavior and evaluating performance. Traditional
                 methods of System Identification are usually
                 time-consuming, costly, and difficult to use in other
                 than a product development environment. Within the last
                 decade, more sophisticated techniques for system
                 identification have been developed that can
                 simultaneously estimate many parameters accurately and
                 repeatedly. These modern techniques are efficient, easy
                 to use, inexpensive, and adaptable to manufacturing and
                 in-the-field environments where they can be used to
                 evaluate product quality and performance. This paper
                 describes the use of one such system identification
                 algorithm to estimate several mechanical parameters of
                 8-inch hard-disk drive spindles in a manufacturing-like
                 setting.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, USA",
  affiliationaddress = "IBM, USA",
  classcodes =   "B0170L (Inspection and quality control); C1220
                 (Simulation, modelling and identification); C5320C
                 (Storage on moving magnetic media); C7440 (Civil and
                 mechanical engineering)",
  classification = "721; 722; 731; 913",
  corpsource =   "IBM Syst. Products Div., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "8-inch hard-disk drive spindles; algorithms; behavior;
                 computing; control systems --- Identification; data;
                 data storage, magnetic --- Disk; design; dynamic
                 systems; environment; evaluating; evaluating
                 performance; experimental verification;
                 experimentation; hard discs; hard-disk drive;
                 identification; Identification; identification of
                 dynamic systems; in-the-field environments;
                 input-output data; manufacturing environment;
                 measurement; mechanical; mechanical engineering;
                 observed system input-output; parameters; performance;
                 predicting; product development; product quality;
                 production control; quality control; system
                 identification; systems science and cybernetics;
                 verification",
  subject =      "H.1.1 Information Systems, MODELS AND PRINCIPLES,
                 Systems and Information Theory, General systems theory
                 \\ C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Klokholm:1987:DFT,
  author =       "Erik Klokholm",
  title =        "Delamination and Fracture of Thin Films",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "5",
  pages =        "585--591",
  month =        sep,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The fracture and delamination of thin films is a
                 relatively common occurrence, and prevention of these
                 mechanical failures is essential for the successful
                 manufacture of thin-film devices. Internal elastic
                 stresses are an inherent part of the thin-film
                 deposition process, and are largely responsible for the
                 mechanical failures of thin films. However, it is not
                 the magnitude of the film stress S which governs film
                 fracture or delamination, but the elastic energy U
                 stored in the film. This presentation shows that the
                 mechanical stability of the film and the substrate
                 requires that U be less than a critical value U$_c$ and
                 that U$_c$ is dependent upon the surface energy
                 gamma.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, USA",
  affiliationaddress = "IBM, USA",
  classcodes =   "A6860 (Physical properties of thin films,
                 nonelectronic); B2220E (Thin film circuits)",
  classification = "421; 539; 931",
  corpsource =   "IBM Corp., Thornwood, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "delamination; delamination of thin films; design;
                 elasticity --- Thin Films; Failure; film delamination;
                 film deposition process; film fracture; films; fracture
                 mechanics; fracture of thin; internal elastic stresses;
                 measurement; mechanical; mechanical failures;
                 mechanical stability; performance; stability; stored
                 elastic energy; surface energy; thin film devices; thin
                 films; thin-; thin-film deposition; thin-film devices",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Geffken:1987:CMD,
  author =       "Robert M. Geffken and James G. Ryan and George J.
                 Slusser",
  title =        "Contact Metallurgy Development for {VLSI} Logic",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "608--616",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The criteria involved with the choice of an ohmic
                 contact material for VLSI logic are discussed. The
                 problems of aluminum penetration encountered with Al
                 metallization and solid-phase epitaxy associated with
                 Al-Si metallization make these interconnect materials
                 incompatible with VLSI technology. The contact
                 resistance characteristics of palladium and platinum
                 silicides were compared to the contact resistance
                 obtained using a titanium contact layer. The contact
                 resistance of palladium silicide increased with
                 extended annealing at 400 degree C, while the PtSi and
                 Ti contact materials exhibited stable contact
                 resistance under these conditions. A Ti\slash
                 Al-Cu\slash Si process which is compatible with a
                 lift-off patterning technique and partial coverage of
                 contacts is described. Rutherford backscattering
                 results indicate that copper and silicon additions to
                 the aluminum metallization retard the Ti-Al reaction.
                 SIMS data show that silicon in Ti\slash Al-Cu\slash Si
                 films redistributes during heat treatment, accumulating
                 at the Ti\slash Al-Cu interface.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340N (Metal-nonmetal contacts); B0530 (Metals and
                 alloys); B2530D (Semiconductor-metal interfaces);
                 B2550F (Metallisation); B2570 (Semiconductor integrated
                 circuits)",
  classification = "531; 539; 541; 713; 714; 721",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al; AlSi; aluminum and alloys --- Metallizing;
                 aluminum penetration; backscattering results; contact;
                 contact metallurgy; contact resistance; Contacts;
                 contacts; design; heat treatment; integrated circuit
                 technology; integrated circuits, VLSI; interconnect
                 materials; lift-off patterning; logic devices;
                 metallisation; metallization; ohmic; ohmic contact
                 material; palladium compounds; partial coverage of
                 contacts; Pd$_2$Si; platinum compounds; PtSi; resistant
                 characteristic; Rutherford; Rutherford backscattering;
                 selection criteria; silicides; SIMS data; solid-phase
                 epitaxy; technique; Ti contact materials; Ti-AlCu-Si;
                 titanium; VLSI; VLSI logic",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ C.4
                 Computer Systems Organization, PERFORMANCE OF SYSTEMS,
                 Design studies \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Electronics",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Stork:1987:EMI,
  author =       "J. M. C. Stork and E. Ganin and J. D. Cressler and G.
                 L. Patton and G. A. Sai-Halasz",
  title =        "Electrical and Microstructural Investigation of
                 Polysilicon Emitter Contacts for High-Performance
                 Bipolar {VLSI}",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "617--626",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Key electrical characteristics of polysilicon emitter
                 contacts in bipolar transistors, such as contact
                 resistance and recombination velocity, are sensitive to
                 the microstructure of the polysilicon\slash
                 single-crystal silicon interface. We correlated the
                 microstructural and electrical characteristics of this
                 interface by performing cross-sectional transmission
                 electron microscopy (XTEM) on actual transistors on the
                 same chip where ring-oscillator speeds were measured.
                 The base current and emitter resistance of the fastest
                 devices approached values typical of single-crystal
                 silicon emitters. Interpretation of these electrical
                 data and of the SIMS impurity profile indicates that
                 significant restructuring of the polysilicon\slash
                 single-crystal interface had taken place. This
                 conclusion was confirmed by the XTEM results.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265B (Logic circuits); B2520C (Elemental
                 semiconductors); B2530B (Semiconductor junctions);
                 B2550 (Semiconductor device technology); B2560J
                 (Bipolar transistors); B2570B (Bipolar integrated
                 circuits)",
  classification = "549; 701; 713; 714; 933",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktowm Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "actual transistors; base current; bipolar integrated
                 circuits; bipolar transistors; bipolar VLSI; contact
                 resistance; cross-sectional; crystal Si; crystals;
                 design; Electric Properties; electrical data; electron
                 microscopy; elemental; emitter contacts; emitter
                 resistance; fastest devices; high-performance;
                 integrated; integrated circuit technology; integrated
                 circuits, VLSI; junctions; key electrical
                 characteristics; logic circuits; measurement;
                 microstructural investigation; microstructure;
                 performance; polycrystal Si-single; polycrystalline Si
                 emitter contacts; polysilicon; recombination velocity;
                 ring-oscillator speeds; secondary ion mass spectra;
                 semiconducting silicon; semiconductor; semiconductor
                 technology; semiconductors; silicon; SIMS impurity
                 profile; transistors, bipolar; transmission;
                 transmission electron microscopy; VLSI; XTEM",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS, Design studies",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Taur:1987:SCS,
  author =       "Y. Taur and B. Davari and D. Moy and J. Y.-C. Sun and
                 C. Y. Ting",
  title =        "Study of Contact and Shallow Junction Characteristics
                 in Submicron {CMOS} with Self-Aligned Titanium
                 Silicide",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "627--633",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The contact resistance between TiSi$_2$ and shallow
                 n** plus /p** plus source-drains in CMOS is studied for
                 a variety of junction depths and silicide thicknesses.
                 The contact contribution to the total device series
                 resistance can be significant if excessive silicon and
                 dopants are consumed during silicide formation. Low
                 contact resistances are obtained for 0.15-$\mu$m n**
                 plus and 0.20-$\mu$m p** plus junctions when the
                 titanium thickness is reduced to keep a high doping
                 concentration at the TiSi$_2$/Si interface.
                 Alternatively, a nonstandard process can be employed to
                 implant additional dopants into the titanium. A thin
                 layer of dopants then out-diffuses into the silicon
                 after the silicide reaction and anneal to help reduce
                 contact resistance and leakage currents. The latter
                 technique is more extendable to CMOS devices which
                 require thicker titanium films and\slash or shallower
                 junctions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2530B (Semiconductor junctions); B2570D (CMOS
                 integrated circuits)",
  classification = "542; 549; 701; 712; 713; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "$n^+p^+$ source-drains; 150 nm; 200 nm;
                 characteristics; CMOS integrated circuits; contact
                 contribution; contact resistance; design; doping
                 concentration; implant additional dopants; integrated
                 circuit manufacture; integrated circuit technology;
                 interface; junction depths; leakage currents;
                 measurement; nonstandard process; of dopants;
                 Performance; performance; scaling; self-aligned
                 TiSi$_2$; semiconductor devices, MOS; semiconductor
                 materials; series resistance; shallow; shallow
                 junction; silicide; submicron CMOS; thicknesses; thin
                 layer; TiSi/sub 2/-Si; titanium and alloys; titanium
                 compounds; titanium silicide",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Memory technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS, Design studies",
  treatment =    "A Application; B Bibliography; P Practical; X
                 Experimental",
}

@Article{Krusin-Elbaum:1987:OSC,
  author =       "L. Krusin-Elbaum and R. V. Joshi",
  title =        "Oxidation of {Si-Rich} Chemical-Vapor-Deposited Films
                 of Tungsten Silicide",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "634--640",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have studied dry oxidation characteristics of
                 Si-rich WSi$_x$ thin films prepared by LPCVD directly
                 on SiO$_2$, with x equals 2.7 for as-deposited films.
                 It has been reported previously that thin (less than
                 100 nm) CVD tungsten silicide adheres well to SiO$_2$.
                 Using Auger depth profiling and Rutherford
                 backscattering spectroscopies, we find that silicon in
                 excess of stoichiometric WSi$_2$ diffuses through the
                 silicide toward the surface to form a SiO$_2$
                 passivating overlayer. The extracted activation energy
                 for this oxidation process is E$_a$ equals 1.2 eV,
                 consistent with oxygen diffusion in SiO$_2$. A similar
                 value of E$_a$ is found for WSi$_x$ deposited on
                 polysilicon. During the anneal, the stoichiometry x of
                 WSi$_x$ decreases monotonically with the annealing
                 temperature, reaching x equals 2 after 30 min at 900
                 degree C or 20 min at 950 degree C. Longer times or
                 higher temperatures result in silicon depletion, with x
                 equals 1.7 after 30 min at 1000 degree C.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520F (Vapour deposition); B2550E (Surface
                 treatment); B2550G (Lithography)",
  classification = "543; 549; 712; 714; 804",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1.2; 30 min; 500 nm; 900 C; activation energy;
                 annealing; annealing temperature; Auger depth
                 profiling; beam lithography; Chemical Vapor Deposition;
                 chemical vapour deposition; CVD coatings; design; dry
                 oxidation; dry oxidation characteristics; e-; eV;
                 experimentation; FET processing sequence; films; gate
                 electrode; homogenization anneal; homogenization steps;
                 integrity of fine line structures; LPCVD; LPCVD direct
                 on; measurement; oxidation; oxidation processes;
                 passivating overlayer; performance; reoxidation;
                 resistivity; Rutherford backscattering; scaling;
                 scanning electron micrograph; SEM; semiconducting
                 silicon; semiconductor materials; semiconductor
                 technology; Si-rich chemical-vapor-deposited; SiO$_2$;
                 SIO/sub 2/; spectroscopies; standard; stoichiometry;
                 submicron VLSI; tungsten and alloys --- Oxidation;
                 tungsten silicide; vertical profiles; WSi$_x$ thin
                 films; WSi$_x$-SiO$_2$",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS, Design studies",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Stapper:1987:CAP,
  author =       "C. H. Stapper",
  title =        "Correlation Analysis of Particle Clusters on
                 Integrated Circuit Wafers",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "641--650",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Defect clustering results in correlations between the
                 numbers of defects or faults that occur on integrated
                 circuit chips located adjacent to one another on
                 semiconductor wafers. Until now, it has been believed
                 that correlations of this type were not accounted for
                 in existing yield models. It is shown that such
                 correlations are present in yield models based on mixed
                 or compound Poisson statistics. A quadrat analysis of
                 particle distributions on semiconductor wafers is used
                 to compare data and theory. The results show that the
                 theoretical correlation coefficients are in agreement
                 with the experimental ones. It was also determined from
                 the particle data how these correlation coefficients
                 vary as the distance between quadrats is increased.
                 This variation provides a convenient method for
                 determining the cluster dimensions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2550 (Semiconductor device technology); B2570
                 (Semiconductor integrated circuits)",
  classification = "713; 714; 922",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "compound Poisson; correlation analysis; defect
                 clustering; Defects; design; integrated circuit chips;
                 integrated circuit manufacture; integrated circuit
                 wafers; measurement; particle clusters; particle
                 distributions; performance; Poisson statistics; quadrat
                 analysis; reliability; semiconductor technology;
                 semiconductor wafers; statistical methods; statistics;
                 theoretical correlation coefficients; theory; wafers;
                 yield models",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ B.7.m Hardware, INTEGRATED CIRCUITS,
                 Miscellaneous \\ G.3 Mathematics of Computing,
                 PROBABILITY AND STATISTICS \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Goyal:1987:MAC,
  author =       "Ambuj Goyal and Stephen S. Lavenberg",
  title =        "Modeling and Analysis of Computer System
                 Availability",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "651--664",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The quantitative evaluation of computer-system
                 availability is becoming increasingly important in the
                 design and configuration of commercial computer
                 systems. This paper deals with methods for constructing
                 and solving large Markov-chain models of
                 computer-system availability. A set of powerful
                 high-level modeling constructs is discussed that can be
                 used to represent the failure and repair behavior of
                 the components that comprise a system, including
                 important component interactions, and the repair
                 actions that are taken when components fail. If
                 time-independent failure and repair tests are assumed,
                 then a time-homogeneous continuous-time Markov chain
                 can be constructed automatically from the modeling
                 constructs used to describe the system. Markov chains
                 having tens of thousands of states can be readily
                 constructed in this manner. Techniques that are
                 particularly suitable for numerically solving such
                 large Markov chains are discussed, including techniques
                 for computing the sensitivities of availability
                 measures with respect to model parameters.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); C0310H (Equipment and software
                 evaluation methods); C1210B (Reliability theory)",
  classification = "722; 723; 913; 922",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automatic Markov-; behavior; chain
                 construction; commercial computer systems; component
                 interactions; computer system availability; computer
                 system modeling; computer systems, digital;
                 computer-system availability; design; example; failure
                 and repair; fault tolerant computing; high-level
                 modeling; high-level modeling constructs; languages;
                 Markov-chain models; Mathematical Models; measurement;
                 model-solution methods; modeling constructs; models;
                 performance; probability; program package; quantitative
                 evaluation; reliability; reliability theory; repair
                 rates; SAVE; solving large Markov-chain; System
                 Availability Estimator; tens of thousands of states;
                 time-homogeneous continuous-time Markov chain;
                 time-independent failure",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS, Modeling techniques \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS, Reliability,
                 availability, and serviceability \\ B.1.4 Hardware,
                 CONTROL STRUCTURES AND MICROPROGRAMMING, Microprogram
                 Design Aids, Languages and compilers \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "G General Review",
}

@Article{Scoggin:1987:F,
  author =       "Donald M. Scoggin and James E. {Hall, Jr.}",
  title =        "Ferroresonance",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "665--678",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a mathematical model for
                 ferroresonant circuits that addresses some of the
                 deficiencies of earlier analyses of ferroresonant
                 regulators. Derived using piecewise-linear, normalized
                 differential equations, the model accommodates
                 nonlinear behavior and predicts circuit performance in
                 terms of parameters such as line voltage, frequency,
                 and load. A phase-plane analysis is used to simplify
                 the determination of linear regions of operation
                 between nonlinear events. Numerical solutions of the
                 resulting equations are used to generate time-domain
                 and parametric performance curves. The results compare
                 well with experiments and suggest potential
                 applications in the design of high-frequency voltage
                 regulators.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1210 (Power electronics, supply and supervisory
                 circuits); C3110B (Voltage); C3220 (Controllers);
                 C3340H (Electric systems)",
  classification = "706; 713; 715",
  corpsource =   "IBM Corp., Research Triangle Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "behavior; deficiencies of; design; design of high-;
                 earlier analyses; electronic circuits; experimentation;
                 ferromagnetic resonance; ferroresonance; ferroresonant
                 circuits; ferroresonant regulators; frequency;
                 frequency voltage regulators; high-frequency voltage
                 regulators; line; line voltage; linear; load;
                 mathematical model; measurement; nonlinear; normalized
                 differential equations; parameters; parametric;
                 performance; performance curves; phase-plane analysis;
                 piecewise-; potential applications; predicts circuit
                 performance; Resonance; theory; voltage; voltage
                 control; voltage regulators; voltage regulators ---
                 Design",
  subject =      "G.m Mathematics of Computing, MISCELLANEOUS \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics",
  treatment =    "A Application; X Experimental",
}

@Article{Zable:1987:FDH,
  author =       "J. L. Zable and H. C. Lee",
  title =        "Font Design for High-Speed Impact Line Printers",
  journal =      j-IBM-JRD,
  volume =       "31",
  number =       "6",
  pages =        "679--683",
  month =        nov,
  year =         "1987",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In impact line printers that use print-band (or
                 similar) technology, the higher speed required of the
                 type band for higher print throughput results in wide
                 printed strokes with increased slur. Ordinarily, font
                 designers compensate for the increased printed
                 strokewidth by narrowing the width of the engraved
                 characters on the type band. While this approach
                 corrects the total printed character stroke, the print
                 quality is degraded because of increased slur. This
                 paper presents an alternative design approach in which
                 an examination of the essential parameters of print
                 dynamics suggests a font design that incorporates wider
                 strokewidths.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)",
  classification = "722; 745",
  corpsource =   "IBM Syst. Products Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer peripheral equipment; design; essential
                 parameters; font; font design; high-speed impact line
                 printers; impact line printers; print band printer;
                 print dynamics; print quality; print throughput;
                 printed strokes; printers; Printers; printing machinery
                 --- Performance; slur; strokewidths; theory; wider
                 strokewidths",
  subject =      "B.4.2 Hardware, INPUT/OUTPUT AND DATA COMMUNICATIONS,
                 Input/Output Devices, Data terminals and printers \\
                 G.m Mathematics of Computing, MISCELLANEOUS",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical; X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Wheeler:1988:WSS,
  author =       "John Archibald Wheeler",
  title =        "World as System Self-Synthesized by Quantum
                 Networking",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "4--15",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The quantum, strangest feature of this strange
                 universe, cracks the armor that conceals the secret of
                 existence. In contrast to the view that the universe is
                 a machine governed by some magic equation, we explore
                 here the view that the world is a self-synthesizing
                 system of existences, built on observer-participancy
                 via a network of elementary quantum phenomena. The
                 elementary quantum phenomenon in the sense of Bohr, the
                 elementary act of observer-participancy, develops
                 definiteness out of indeterminism, secures a
                 communicable reply in response to a well-defined
                 question. The rate of carrying out such yes-no
                 determinations, and their accumulated number, are both
                 minuscule today when compared to the rate and number to
                 be anticipated in the billions of years yet to come.
                 The coming explosion of life opens the door, however,
                 to an all-encompassing role for observer-participancy:
                 to build, in time to come, no minor part of what we
                 call its past --- our past, present, and future --- but
                 this whole vast world.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0365 (Quantum theory; quantum mechanics); A0370
                 (Theory of quantized fields)",
  classification = "931",
  corpsource =   "Dept. of Phys., Texas Univ., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "continuum of number theory; delayed choice experiment;
                 elementary quantum; elementary quantum phenomena;
                 explosion of life; indeterminancy; indeterminism;
                 network of elementary quantum phenomena; observer
                 participancy; observer-participancy; phenomenon;
                 quantum networking; quantum theory; role for; self-;
                 self-synthesized systems; synthesizing system of
                 existences; theory; world as self synthesizing system",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bennett:1988:NHR,
  author =       "Charles H. Bennett",
  title =        "Notes on the History of Reversible Computation",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "16--23",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "01A60 (68-03 81C99 94A15)",
  MRnumber =     "89i:01045",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Basic concepts in quantum and stochastic transport.",
  abstract =     "We review the history of the thermodynamics of
                 information processing, beginning with the paradox of
                 Maxwell's demon; continuing through the efforts of
                 Szilard, Brillouin, and others to demonstrate a
                 thermodynamic cost of information acquisition; the
                 discovery by Landauer of the thermodynamic cost of
                 information destruction; the development of theory of
                 and classical models for reversible computation; and
                 ending with a brief survey of recent work on quantum
                 reversible computation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4200 (Computer theory)",
  classification = "641",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "billiard-ball computation model; classical models;
                 computation theory; cost of information destruction;
                 design; history; information processing; paradox of
                 Maxwell's demon; quantum; quantum reversible
                 computation; reversible computation; theory;
                 thermodynamic; thermodynamic cost of information
                 acquisition; thermodynamic cost of information
                 destruction; thermodynamics; thermodynamics of",
  subject =      "H.1.1 Information Systems, MODELS AND PRINCIPLES,
                 Systems and Information Theory \\ G.m Mathematics of
                 Computing, MISCELLANEOUS",
  treatment =    "G General Review",
}

@Article{Keyes:1988:MEL,
  author =       "R. W. Keyes",
  title =        "Miniaturization of Electronics and its Limits",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "24--28",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The long-continued advance of the performance of
                 information processing technologies has been based on
                 miniaturization of components. The history of
                 miniaturization is presented through examples. They
                 suggest that limits proposed by Landauer in the 1960s
                 will be reached in two or three decades.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0140 (Administration and management); B1265D (Memory
                 circuits); B2570 (Semiconductor integrated circuits);
                 C0200 (General computer topics); C5320 (Digital
                 storage)",
  classification = "713; 714",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "design; digital storage; electronics miniaturization;
                 history; history of miniaturization; information
                 processing technologies; integrated circuit technology;
                 Landauer limits; limitations; limits of
                 miniaturization; microelectronics; miniaturization
                 history; miniaturization of components; miniaturization
                 of electronics; physical limits; solid state devices;
                 technological forecasting",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.m Hardware,
                 MISCELLANEOUS",
  treatment =    "G General Review",
}

@Article{Toffoli:1988:ITO,
  author =       "Tommaso Toffoli",
  title =        "Information Transport Obeying the Continuity
                 Equation",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "29--36",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A15 (82A99)",
  MRnumber =     "89j:94013",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Basic concepts in quantum and stochastic transport.",
  abstract =     "We analyze nontrivial dynamical systems in which
                 information flows as an additive conserved quantity ---
                 and thus takes on a strikingly tangible aspect. To
                 arrive at this result, we first give an explicit
                 characterization of equilibria for a family of lattice
                 gases.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6110 (Information theory); C1260 (Information
                 theory)",
  classification = "921; 931",
  corpsource =   "Lab. for Comput. Sci., MIT., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "additive conserved; continuity equation; dynamical
                 systems; dynamics; information flows; information
                 theory; information transport; lattice gases; mass and
                 information perturbations; nontrivial; nontrivial
                 dynamic systems; quantity; small perturbations from
                 equilibrium; tangible aspect; theory",
  reviewer =     "Masanori Ohya",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics \\ G.2.m Mathematics of Computing,
                 DISCRETE MATHEMATICS, Miscellaneous",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kuhn:1988:OLP,
  author =       "Hans Kuhn",
  title =        "Origin of Life and Physics: Diversified Microstructure
                 --- Inducement to Form Information-Carrying and
                 Knowledge-Accumulating Systems",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "37--46",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The process leading to the origin and evolution of
                 life is caused by the presence of distinct physical and
                 chemical conditions at a distinct location in the
                 universe. A specified system originates and evolves
                 under the continuous influence of a complex operational
                 environment. The system develops toward increasing
                 independence of the original environment by becoming
                 increasingly complex. Modeling a detailed scenario
                 consisting of a sequence of reasonable physico-chemical
                 steps is essential in rationalizing the phenomenon. The
                 basic process, accumulation of knowledge by
                 continuously testing environmental properties, is
                 intimately related to the measuring process in physics.
                 Evolution is a physical process, and this process leads
                 to man developing physics. Thus physics appears to be
                 self-consistent --- the basis and consequence of
                 evolution. The physics-producing system is considered
                 to be a measuring and information-processing device
                 based upon the mechanism which operates in the origin
                 and evolution of life.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6110 (Information theory); C1260 (Information
                 theory)",
  classification = "931; 932",
  corpsource =   "Max-Plank-Inst. for Biophys. Chem., Gottingen, West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accumulation of knowledge; becoming increasingly
                 complex; chemical steps; complex; continuous influence;
                 diversified microstructure; evolution of life;
                 independence; information carrying systems; information
                 theory; information-carrying and knowledge-accumulating
                 systems; information-processing device;
                 knowledge-accumulating; Landauer's modulated potential
                 computer; Landauer's self-consistency; operational
                 environment; origin of; origin of life; origin of life
                 and physics; physico-; physico-chemical steps; physics;
                 physics-producing; system; system develops toward
                 increasing; systems; theory",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics \\ H.1.1 Information Systems,
                 MODELS AND PRINCIPLES, Systems and Information Theory,
                 General systems theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Erdos:1988:DSO,
  author =       "Paul Erdos",
  title =        "Density of States of One-Dimensional Random
                 Potentials",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "47--51",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Following an introduction to the early history of the
                 theories of the density of electronic states in
                 one-dimensional structures, pioneered, among others, by
                 R. Landauer and J. C. Helland, a particular model, that
                 of a multistep random potential, is discussed. It is
                 shown that Kolmogorov-type equations can be obtained
                 for the probability distribution of the phase of the
                 wave function, and, by solving these equations, the
                 density of states may be calculated. An analogy with
                 the classical rotator in a random force field is worked
                 out, and helps in visualizing the results.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7110 (General theories and computational techniques);
                 A7120A (Developments in mathematical and computational
                 techniques)",
  classification = "921; 931",
  corpsource =   "Inst. of Theor. Phys., Lausanne Univ., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "classical rotator; density of electronic states;
                 electronic density of states; field; Kolmogorov-type
                 equations; Molecular; multistep random potential;
                 one-dimensional random potentials; one-dimensional
                 structures; physics; probability distribution; random
                 force; rotator model; stationary probability densities;
                 theory; two-step random potential; wave function phase;
                 wave function probability distribution",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ G.m Mathematics of
                 Computing, MISCELLANEOUS",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Azbel:1988:BEM,
  author =       "Mark Ya. Azbel",
  title =        "{Bloch} Electron in a Magnetic Field: Mixed
                 Dimensionality and the Magnetic-Field-Induced
                 Generalized Quantum {Hall} Effect",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "52--57",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The energy spectrum of a Bloch electron in a magnetic
                 field is one-dimensional. This leads to the Peierls
                 instability and the magnetic-field-induced transition
                 to the quantized Hall effect. The wave function is
                 two-dimensional. This decreases the Peierls gap and
                 makes it exponentially vanishing with magnetic field.
                 Disorder lifts the degeneracy and one-dimensionality of
                 the spectrum. High disorder yields a metallic behavior.
                 Intermediate disorder leads to the generalized
                 quantized Hall effect. The latter has a finite
                 magnetoresistance as a semimetal, and Hall plateaus
                 similar to the quantized ones, but they may have any
                 value of the effective charge.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7215N (Collective modes; low-dimensional conductors);
                 A7220M (Galvanomagnetic and other magnetotransport
                 effects)",
  classification = "701; 921; 931; 932",
  corpsource =   "Dept. of Phys., Tel-Aviv Univ., Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Bloch electron; electrons; experimentation; hall
                 effect; magnetic fields; magnetic-field-induced
                 generalized quantum Hall effect; metal-GHE-GQHE phase
                 diagram; mixed dimensionality; Peierls instability;
                 Schr{\"o}dinger equation; theory; Peierls instability;
                 quantum Hall effect; Bloch electron in magnetic field;
                 two dimensional wave; function; disorder effects; Bloch
                 electron; mixed; dimensionality; magnetic-field-induced
                 generalized quantum; Hall effect; energy spectrum;
                 Peierls instability; magnetic-; field-induced
                 transition; quantized Hall effect; Peierls; gap;
                 exponentially vanishing with magnetic field;
                 degeneracy; one-dimensionality; metallic behaviour;
                 finite; magnetoresistance; semimetal; Hall plateaus",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ G.m Mathematics of
                 Computing, MISCELLANEOUS",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Sorbello:1988:RRD,
  author =       "R. S. Sorbello and C. S. Chu",
  title =        "Residual Resistivity Dipoles, Electromigration, and
                 Electronic Conduction in Metallic Microstructures",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "58--62",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "For an impurity in a bulk metal, the connection
                 between electromigration and electric fields associated
                 with DC conductivity is understood in terms of
                 Landauer's residual resistivity dipole. This connection
                 is examined, and appropriate generalizations are made
                 for an impurity in a two-dimensional electron gas and
                 for an impurity near a metal surface. The residual
                 resistivity dipole field decays less rapidly with
                 distance in a two-dimensional gas than in bulk, thus
                 resulting in a larger voltage drop across an impurity
                 in the system of lower dimensionality.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6630Q (Electromigration); A7145 (Collective effects);
                 A7210 (Theory of electronic transport; scattering
                 mechanisms)A7215 (Electronic conduction in metals and
                 alloys)",
  classification = "531; 921; 931",
  corpsource =   "Wisconsin Univ., Milwaukee, WI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bulk metal; bulk metals; conduction; DC conductivity;
                 dipole; electric; electrical conductivity of solids;
                 electromigration; electron gas; electronic; electronic
                 conduction; Electronic Properties; fields;
                 generalizations; impurities; impurity in 2D electron
                 gas; impurity in bulk metal; impurity near metal
                 surface; Landauer's residual resistivity; Landauer's
                 residual resistivity dipole; larger voltage; metallic
                 microstructures; metals and alloys; residual
                 resistivity dipole field; residual resistivity dipoles;
                 theory; two-dimensional electron gas",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ G.m Mathematics of
                 Computing, MISCELLANEOUS",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Buttiker:1988:CST,
  author =       "M. Buttiker",
  title =        "Coherent and Sequential Tunneling in Series Barriers",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "63--75",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A simple approach which can describe both coherent
                 tunneling and sequential tunneling is applied to
                 resonant tunneling through a double-barrier structure.
                 This approach models phase-randomizing events by
                 connecting to the conductor a side branch leading away
                 from the conductor to a reservoir. The reservoir does
                 not draw or supply a net current, but permits inelastic
                 events and phase randomization. A conductance formula
                 is obtained which contains contributions due to both
                 coherent and sequential tunneling. We discuss the
                 limiting regimes of completely coherent tunneling and
                 completely incoherent transmission, and discuss the
                 continuous transition between the two. Over a wide
                 range of inelastic scattering times tunneling is
                 sequential. The effect of inelastic events on the
                 peak-to-valley ratio and the density of states in the
                 resonant well is investigated. We also present an
                 analytic discussion of the maximum peak conductance e/
                 H D-BAR of an isolated resonance in a many-channel
                 conductor.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340G (Tunnelling: general); B2530 (Semiconductor
                 junctions and interfaces)",
  classification = "714; 921",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analytic; Brett and Wigner formulae; Charge Carriers;
                 coherent and sequential tunneling; coherent tunneling;
                 completely coherent tunneling; completely incoherent;
                 conductance formula; continuous transition; density of
                 states; discussion; double-barrier structure; effect of
                 inelastic events; inelastic scattering times; isolated
                 resonance; limiting regimes; many-channel conductor;
                 maximum peak conductance; models; peak-to-valley; phase
                 randomization; phase-; randomizing events; range of
                 inelastic; ratio; resonant tunneling; resonant well;
                 scattering times; semiconductor materials; sequential
                 tunneling in series barriers; series barriers; theory;
                 transmission; tunnelling",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics \\ G.m Mathematics of Computing,
                 MISCELLANEOUS",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fisher:1988:DEE,
  author =       "Michael E. Fisher",
  title =        "Diffusion from an Entrance to an Exit",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "76--81",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "82A31 (39A10 82-01 82A41)",
  MRnumber =     "89d:82049",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  note =         "Basic concepts in quantum and stochastic transport.",
  abstract =     "Asymptotic and exact solutions are derived from first
                 principles by various methods for the moments of the
                 number of steps or traversal time, etc., of a particle
                 which diffuses, most specifically on a linear chain, to
                 an exit site without previously leaving via an entrance
                 site. The presentation is expository and uses standard
                 methods.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0250 (Probability theory, stochastic processes, and
                 statistics); A0540 (Fluctuation phenomena, random
                 processes, and Brownian motion); A0550 (Lattice theory
                 and statistics; Ising problems); A0560 (Transport
                 processes: theory)",
  classification = "921; 931; 932",
  corpsource =   "Inst. of Phys. Sci. and Technol., Maryland Univ.,
                 College Park, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "asymptotic/exact solutions; avoidance formula
                 evaluation; derived from first principles; diffusion;
                 diffusion from an entrance to an exit; diffusion on
                 chain; exact solutions; first visits with avoidance;
                 lattice theory and statistics; linear chain; number of;
                 particle beams; pausing walk on chain; probability;
                 random processes; standard methods; steps; stochastic
                 processes; theory; traversal time",
  subject =      "G.3 Mathematics of Computing, PROBABILITY AND
                 STATISTICS \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Physics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Cohen:1988:BTP,
  author =       "M. H. Cohen and M. Y. Chou and E. N. Economou and S.
                 John and C. M. Soukoulis",
  title =        "Band Tails, Path Integrals, Instantons, Polarons, and
                 All that",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "82--92",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reviews the explanations recently developed
                 by the authors and their collaborators of how disorder
                 leads to exponential band tails and to Urbach tails in
                 optical absorption. It starts with the simplest
                 single-potential-well models which, despite their
                 simplicity, are remarkably successful in accounting for
                 the experimental facts. It then identifies the
                 weaknesses, hidden or explicit, in these models and
                 shows, step by step, how they can be corrected by
                 increasing the sophistication of the procedures used.
                 Exact results are finally achieved through use of
                 field-theoretic techniques, and appropriately
                 formulated single-potential-well models are shown to
                 reproduce these quite accurately. It is also shown that
                 the probability distribution of the random potential
                 must be close to Gaussian, with an autocorrelation
                 function which cuts off fairly rapidly with distance
                 for there to be a well-defined, broad energy range in
                 which there are exponential band tails in the density
                 of states and Urbach tails in the optical absorption.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0130R (Reviews and tutorial papers; resource
                 letters); A7110 (General theories and computational
                 techniques); A7125C (Techniques of band-structure
                 calculation (general theory, applications of group
                 theory, analytic continuation, etc.)); A7138 (Polarons
                 and electron-phonon interactions); A7820 (Optical
                 properties of bulk materials)",
  classification = "741; 921",
  corpsource =   "Exxon Res and Eng. Co., Annandale, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "absorption; Absorption; autocorrelation function; band
                 tails; band theory models and calculation methods;
                 density of; disorder effects; exponential band tails;
                 field-theoretic; instantons; light; optical absorption;
                 optics; path integrals; polarons; probability
                 distribution; random potential; reviews; simple
                 potential-well models; simplest single-potential-well
                 models; states; techniques; theory; Urbach tails",
  subject =      "G.m Mathematics of Computing, MISCELLANEOUS \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Verbruggen:1988:FQT,
  author =       "A. H. Verbruggen",
  title =        "Fundamental Questions in the Theory of
                 Electromigration",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "93--98",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The theory of electromigration is focused on the force
                 acting on a lattice defect in a metallic sample that
                 carries an electric current. Much work has been done to
                 obtain a better understanding of the underlying
                 physical mechanisms. The force has been calculated
                 numerically for defects in several metals, and a
                 qualitative agreement with the experiments has often
                 been found. There are, however, still discussions about
                 the relevance of certain contributions to the force.
                 This paper provides a review of the basic models and of
                 questions which still exist in the theory of
                 electromigration. The relevance of these questions is
                 illustrated by results of experimental work on the
                 electromigration of H in V, Nb, and Ta.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6630Q (Electromigration)",
  classification = "531; 921",
  corpsource =   "Center for Submicron Technol., Delft Univ. of
                 Technol., Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "basic models; conceptual difficulties; conduction
                 electrons; current flow inhomogeneities; direct force;
                 electric field inhomogeneities; electromigration;
                 electromigration theory; field inhomogeneities; force
                 acting on lattice defect; fundamental questions; H in;
                 H in Ta; H in V; hydrogen; impurity; lattice defects;
                 metals and alloys; Nb; niobium; screening of electric
                 fields; tantalum; theory of electromigration;
                 underlying physical mechanisms; vanadium; wind force",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Foden:1988:TTQ,
  author =       "C. Foden and K. W. H. Stevens",
  title =        "Tunneling Times and a Quantum Clock",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "99--102",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of measuring tunneling times by means of a
                 quantum clock is found to lead to difficulties which
                 are thought to arise because the Hamiltonian of the
                 coupled system does not separate into particle and
                 clock parts.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0365B (Foundations, theory of measurement,
                 miscellaneous theories); A0530 (Quantum statistical
                 mechanics); A7340G (Tunnelling: general); B2530
                 (Semiconductor junctions and interfaces)",
  classification = "921; 931; 932",
  corpsource =   "Dept. of Phys., Nottingham Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "clock interference effects; clocks; coupled system;
                 coupled system Hamiltonian; difficulties; free
                 particle; Hamiltonian; Hamiltonian of coupled systems;
                 Measurements; measuring tunneling times; particle;
                 particle beams; quantum clock; quantum mechanics;
                 quantum statistical mechanics; quantum theory;
                 tunneling times; tunnelling",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gefen:1988:CVO,
  author =       "Yuval Gefen",
  title =        "Coherent Voltage Oscillations in Small Normal Tunnel
                 Junctions and the Crossover to the Incoherent Regime",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "103--106",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We discuss the possibility of charge oscillations in a
                 normal tunnel junction, driven by an external current
                 source ($L_{ex}$), in the coherent limit. In that limit
                 the dephasing time $t_\phi$ is larger than the period
                 $t_p \equiv e / l_{e_x}$. This behavior is modified
                 when $t_\phi$ decreases.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340G (Tunnelling: general); B1230B (Oscillators);
                 B2530 (Semiconductor junctions and interfaces)",
  classification = "714; 921",
  corpsource =   "Dept. of Nucl. Phys., Weizmann Inst. of Sci., Rehovot,
                 Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "circuit oscillations; coherent limit; coherent voltage
                 oscillations; crossover; crossover to incoherent;
                 crossover to the incoherent regime; dephasing time;
                 external current source; incoherent limit; incoherent
                 regime; Junctions; mesoscopic systems; model current
                 source; normal tunnel junctions; possibility of charge
                 oscillations; regime; semiconductor devices; small;
                 small normal tunnel junctions; submicron junctions;
                 tunnelling",
  treatment =    "T Theoretical or Mathematical",
}

@Article{vanKampen:1988:RSN,
  author =       "N. G. {van Kampen}",
  title =        "Relative Stability in Nonuniform Temperature",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "107--111",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Landauer has suggested that the relative stability of
                 a particle diffusing in a bistable potential is
                 affected by an intervening hot layer. We derive this
                 effect both from thermodynamics and from the diffusion
                 equation. For this purpose the proper form of the
                 diffusion equation in a nonuniform medium is
                 established for the case of a Brownian particle. If the
                 diffusion takes place in a ring, the hot layer creates
                 a steady current.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0540 (Fluctuation phenomena, random processes, and
                 Brownian motion); A0560 (Transport processes: theory);
                 A0570 (Thermodynamics)",
  classification = "641; 921; 931; 932",
  corpsource =   "Inst. for Theor. Phys., Utrecht Univ., Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "bistable potential diffusion; Brownian motion;
                 Brownian particle; diffusion; diffusion equation;
                 diffusion equation solution; equation derivation;
                 intervening hot; Landauer effect; layer; Mathematical
                 Models; mathematical techniques --- Applications;
                 medium; nonuniform; nonuniform temperature; particle
                 beams; particle diffusing in bistable potential;
                 relative stability; ring; steady current;
                 thermodynamics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Risken:1988:BTE,
  author =       "H. Risken and K. Vogel and H. D. Vollmer",
  title =        "Boundary-Layer Theory for the Extremely Underdamped
                 {Brownian} Motion in a Metastable Potential",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "112--118",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A theory for the boundary layer near the critical
                 trajectory for the extremely underdamped Brownian
                 motion in a metastable potential is presented. The
                 probability distribution function in phase space near
                 this critical trajectory, the average escape energy,
                 and the correction terms for the zero-friction-limit
                 escape rate are calculated.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0250 (Probability theory, stochastic processes, and
                 statistics); A0540 (Fluctuation phenomena, random
                 processes, and Brownian motion)",
  classification = "921; 931; 932",
  corpsource =   "Theor. Phys. Inst., Ulm Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "average escape energy; boundary layer theory;
                 boundary-layer solution; boundary-layer theory;
                 Brownian motion; correction terms; critical trajectory;
                 distribution function; Mathematical Models;
                 mathematical techniques --- Eigenvalues and
                 Eigenfunctions; mean average energy; metastable
                 potential; particle beams; phase space; probability;
                 underdamped Brownian motion; zero-friction-limit escape
                 rate",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hanggi:1988:BAC,
  author =       "Peter Hanggi and Peter Jung",
  title =        "Bistability in Active Circuits: Application of a Novel
                 {Fokker--Planck} Approach",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "119--126",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The problem of metastability in electronic circuits
                 with negative differential resistance, originally
                 pioneered by Landauer in 1962, is reconsidered from the
                 viewpoint of a Fokker--Planck modeling for nonlinear
                 shot noise (master equation). A novel Fokker--Planck
                 approximation scheme is presented that describes
                 correctly the deterministic flow and the long-time
                 dynamics of the master equation. It is demonstrated
                 that the conventional scheme of a truncated
                 Kramers-Moyal expansion at the second order
                 overestimates the transition rates in leading
                 exponential order. In order to obtain the correct
                 relative stability, the novel scheme uses a diffusion
                 coefficient which incorporates information about global
                 nonlinear fluctuations characterized by the whole set
                 of all higher-order Kramers-Moyal transport
                 coefficients.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0230 (Function theory, analysis); A0540 (Fluctuation
                 phenomena, random processes, and Brownian motion);
                 A0560 (Transport processes: theory); B1265B (Logic
                 circuits); B1270E (Active filters and other active
                 networks); B2560H (Junction and barrier diodes)",
  classification = "713; 714; 921",
  corpsource =   "Augsburg Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "active circuits bistability; active networks;
                 approach; approximation scheme; bistability in active
                 circuits; characterized; correct relative stability;
                 deterministic flow; differential resistance; diffusion;
                 diffusion coefficient; dynamics; electronic circuits;
                 flip-flops; fluctuations; Fokker-; Fokker--Planck;
                 Fokker--Planck approach; Fokker--Planck modeling; for
                 nonlinear shot noise; global nonlinear fluctuations;
                 Landauer; long-time; master equation; Mathematical
                 Models; mathematical techniques --- Applications;
                 metastability in electronic circuits; negative;
                 nonlinear shot noise; novel Fokker--Planck; Planck
                 equation; processes; random noise; semiconductor
                 diodes, tunnel --- Mathematical Models; set of all
                 higher-order Kramers-Moyal; transition rates;
                 transport; transport coefficients; tunnel diode
                 current-voltage characteristics; tunnel diode with
                 noise; tunnel diodes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Gardiner:1988:QNQ,
  author =       "C. W. Gardiner",
  title =        "Quantum Noise and Quantum {Langevin} Equations",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "127--136",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The quantum Langevin equation of Ford, Kac, and Mazur
                 is rederived and shown to be equivalent to an adjoint
                 equation. This latter can be handled by means of van
                 Kampen's cumulant expansion to yield derivations of the
                 quasiclassical Langevin equation, stochastic
                 electrodynamics, quantum optical, and quantum Brownian
                 motion master equations (under appropriate conditions).
                 The result of Benguria and Kac --- that the quantum
                 Langevin equation yields the Boltzmann distribution
                 over energy levels in thermodynamic equilibrium --- is
                 also verified.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0230 (Function theory, analysis); A0250 (Probability
                 theory, stochastic processes, and statistics); A0530
                 (Quantum statistical mechanics); A0540 (Fluctuation
                 phenomena, random processes, and Brownian motion);
                 A0560 (Transport processes: theory); A0570
                 (Thermodynamics)",
  classification = "921; 931",
  corpsource =   "Dept. of Phys., Waikato Univ., Hamilton, New Zealand",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "adjoint equation; Boltzmann distribution; Boltzmann
                 equation; derivations; electrodynamics; equation
                 derivation commutation relations preservation; master
                 equation; Mathematical Models; mathematical techniques
                 --- Applications; noise; quantum; quantum Brownian
                 motion master equations; quantum Langevin equations;
                 quantum noise; quantum optical case; quantum theory;
                 quasiclassical Langevin equation; statistical
                 mechanics; stochastic; stochastic processes; theory;
                 thermodynamic equilibrium; thermodynamics; van Kampen
                 cumulant expansion; Wigner function",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pendry:1988:STD,
  author =       "John Pendry",
  title =        "Symmetry and Transport in Disordered Systems",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "137--143",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The transfer matrix for a disordered system enables
                 averages of integer powers of the resistance to be
                 found, R**N; application of the symmetric group
                 generalizes this formula to fractional and negative N,
                 providing a powerful tool for the study of transport.
                 Consequences for fluctuations in resistance, 1/f noise,
                 and frequency response are discussed, as well as a new
                 sort of state, of fractal dimension 1/2, which is
                 responsible for transport in localized systems.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0210 (Algebra, set theory, and graph theory); A0250
                 (Probability theory, stochastic processes, and
                 statistics); A0540 (Fluctuation phenomena, random
                 processes, and Brownian motion); A0560 (Transport
                 processes: theory); A7290 (Other topics in electronic
                 transport in condensed matter)",
  classification = "531; 701; 921; 933",
  corpsource =   "Blackett Lab., Imperial Coll., London, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1/2; 1/f noise; direct products; disordered systems;
                 electric conductivity; fluctuations; fluctuations in;
                 fractal dimension; fractals; frequency response;
                 materials; matrix algebra; metallic conductors; noise;
                 Order-Disorder; probability; probability distributions;
                 random; resistance; symmetric group; symmetry and
                 transport; transfer matrix; transfer matrix
                 generalization; transport in disordered systems;
                 transport in localized systems; transport processes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Likharev:1988:CDT,
  author =       "K. K. Likharev",
  title =        "Correlated Discrete Transfer of Single Electrons in
                 Ultrasmall Tunnel Junctions",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "1",
  pages =        "144--158",
  month =        jan,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recent theoretical and experimental studies have
                 revealed a new family of effects taking place in very
                 small tunnel junctions at low temperatures. The effects
                 have a common origin, the correlated discrete tunneling
                 of single electrons and\slash or Cooper pairs resulting
                 from their electrostatic ('Coulomb') interaction. This
                 paper presents a brief review of the single-electron
                 part of the family, including discussion of the
                 background physics, methods of theoretical description
                 of the new effects, experimental results, and possible
                 applications of the new effects in analog and digital
                 electronics.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7340G (Tunnelling: general); B2530 (Semiconductor
                 junctions and interfaces)",
  classification = "701; 714; 931; 932",
  corpsource =   "Dept. of Phys., Moscow State Univ., USSR",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "'set' oscillations; analogue electronics;
                 applications; background physics; correlated discrete
                 transfer; correlated discrete tunneling; Coulomb
                 interaction; description; digital; electronics;
                 electrons; electrostatic; experimental results;
                 experimental studies; interaction; junctions;
                 Junctions; low temperatures; multijunction structures;
                 of single electrons; semiconductor devices; single
                 electron; single electrons; sub-electron charge
                 control; submicron junctions; theoretical; theoretical
                 studies; tunnelling; ultrasmall tunnel; ultrasmall
                 tunnel junctions; very small tunnel",
  treatment =    "A Application; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Bouma:1988:FGF,
  author =       "Gosse Bouma and Esther Koenig and Hans Uszkoreit",
  title =        "Flexible Graph-Unification Formalism and its
                 Application to Natural-Language Processing",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "170--184",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A graph-unification-based representation language is
                 described that was developed as the grammar formalism
                 for the LILOG research project at IBM Germany. The
                 Stuttgart Unification Formalism (STUF) differs from its
                 predecessors in its higher flexibility and its
                 algebraic structure. It is suited for the
                 implementation of rather different linguistic
                 approaches, but is currently employed mainly in the
                 development of Categorial Unification Grammars with a
                 lexicalized compositional semantics. Examples from the
                 syntactic and semantic processing of natural language
                 are used to illustrate the virtues of the formalism and
                 of our lexicalist approach to linguistic analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4210 (Formal logic); C4290 (Other computer theory);
                 C6180N (Natural language processing)",
  classification = "721; 723",
  corpsource =   "Stuttgart Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automata theory; Categorial Unification
                 Grammars; categorical unification grammars;
                 computational linguistics; computer graphics; computer
                 programming languages; flexible graph-unification
                 formalism; formal languages; grammar formalism;
                 Grammars; grammars; graph-unification formalism;
                 languages; lexicalist approach; lexicalized
                 compositional; LILOG; linguistic; natural language;
                 natural languages; natural-language processing;
                 research project; semantic processing; semantics;
                 Stuttgart Unification Formalism; syntactic processing;
                 theory",
  subject =      "I.1.1 Computing Methodologies, ALGEBRAIC MANIPULATION,
                 Expressions and Their Representation, Representations
                 (General and Polynomial) \\ I.1.3 Computing
                 Methodologies, ALGEBRAIC MANIPULATION, Languages and
                 Systems, Nonprocedural languages \\ G.2.m Mathematics
                 of Computing, DISCRETE MATHEMATICS, Miscellaneous \\
                 I.2.7 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
                 Natural Language Processing",
  treatment =    "A Application; T Theoretical or Mathematical",
}

@Article{Black:1988:ECD,
  author =       "Ezra Black",
  title =        "Experiment in Computational Discrimination of
                 {English} Word Senses",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "185--194 (or 185--193??)",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A number of researchers in text processing have
                 independently observed that people can consistently
                 determine in which of several given senses a word is
                 being used in text, simply by examining the half dozen
                 or so words just before and just after the word in
                 focus. The question arises whether the same task can be
                 accomplished by mechanical means. Experimental results
                 are presented which suggest an affirmative answer to
                 this query. Three separate methods of discriminating
                 English word senses are compared
                 information-theoretically. Findings include a strong
                 indication of the power of domain-specific content
                 analysis of text, as opposed to domain-general
                 approaches.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6130 (Speech analysis and processing techniques);
                 C1250C (Speech recognition)",
  classification = "721; 723",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automata theory; computational discrimination;
                 Computational Linguistics; computer metatheory; content
                 analysis; data processing; domain-general approaches;
                 domain-specific; domain-specific content analysis;
                 English word senses; experimentation; human factors;
                 information-theoretically; languages; measurement;
                 performance; processing; speech analysis and
                 processing; speech recognition; text; text processing",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing \\ H.1.2
                 Information Systems, MODELS AND PRINCIPLES,
                 User/Machine Systems, Human information processing \\
                 I.7.0 Computing Methodologies, TEXT PROCESSING, General
                 \\ J.5 Computer Applications, ARTS AND HUMANITIES,
                 Linguistics",
  treatment =    "X Experimental",
}

@Article{Frisch:1988:SAC,
  author =       "Rudolf Frisch and Antonio Zamora",
  title =        "Spelling Assistance for Compound Words",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "195--200",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a method for providing spelling
                 assistance for Germanic compound words. The technique
                 analyzes an unknown word to determine its components,
                 using a dictionary which associates word components
                 with codes that describe their compounding
                 characteristics. Language-specific morphological
                 transformations are used to take into consideration
                 common intraword elision patterns. Special dictionary
                 entries, heuristic rules, and lexical distance measures
                 are used to provide the best possible replacement
                 compound words. The method is fast and provides
                 spelling assistance and hyphenation support in an
                 interactive environment.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7106 (Word processing)",
  classification = "721; 723",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; automata theory; compound words;
                 compounding characteristics; data processing;
                 dictionary; documentation; Germanic; heuristic;
                 hyphenation support; interactive environment; intraword
                 elision patterns; languages; lexical distance measures;
                 morphological; morphological transformations; rules;
                 software packages; spelling assistance;
                 transformations; unknown word; verification; Word
                 Processing; word processing",
  subject =      "I.7.1 Computing Methodologies, TEXT PROCESSING, Text
                 Editing, Spelling",
  treatment =    "P Practical",
}

@Article{Takeda:1988:CES,
  author =       "Koichi Takeda and Emiko Suzuki and Tetsuro Nishino and
                 Tetsunosuke Fujisaki",
  title =        "{CRITAC} --- an Experimental System for {Japanese}
                 Text Proofreading",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "201--216",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes an experimental expert system for
                 proofreading Japanese text. The system is called CRITAC
                 (CRITiquing using Accumulated knowledge). It can detect
                 typographical errors, Kana-to-Kanji conversion errors,
                 and stylistic errors in Japanese text. We describe the
                 basic concepts and features of CRITAC, including
                 preprocessing of text, a high-level text model,
                 Prolog-coded heuristic proofreading knowledge, and a
                 user-friendly interface. Although CRITAC has been
                 primarily designed for Japanese text, it appears that
                 most of the concepts and the architecture of CRITAC can
                 be applied to other languages as well.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7106 (Word processing)",
  classification = "721; 723",
  corpsource =   "Carnegie Mellon Univ., Pittsburgh, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "artificial intelligence --- Expert Systems; automata
                 theory; CRITAC; data processing; documentation; errors;
                 experimental expert system; experimentation; expert
                 systems; friendly interface; high-level text; Japanese
                 text; Kana-to-Kanji conversion; kana-to-kanji
                 conversion errors; languages; model; performance;
                 preprocessing; Prolog-coded heuristic proofreading
                 knowledge; proofreading; stylistic errors; text
                 editing; typographical errors; user-; Word Processing",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Text
                 analysis \\ I.7.1 Computing Methodologies, TEXT
                 PROCESSING, Text Editing",
  treatment =    "P Practical",
}

@Article{DOrta:1988:LSR,
  author =       "Paolo D'Orta and Marco Ferretti and Alex Martelli and
                 Sergio Melecrinis and Stefano Scarci and Giampiero
                 Volpi",
  title =        "Large-Vocabulary Speech Recognition: a System for the
                 {Italian} Language",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "217--226",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We describe a research project in automatic speech
                 recognition which has led to the development of an
                 experimental large-vocabulary real-time recognizer for
                 Italian, and show how the maximum-likelihood techniques
                 which had been employed in the development of prototype
                 recognizers for English can be tailored to a language
                 with substantially different characteristics.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6130 (Speech analysis and processing techniques);
                 C1250C (Speech recognition)",
  classification = "723; 751; 752; 922",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "automatic speech recognition; experimentation; Italian
                 language; languages; large-; large-vocabulary;
                 maximum-likelihood; measurement; pattern recognition
                 systems; performance; probability; real-time
                 recognizer; Recognition; speech; speech recognition;
                 techniques; theory; verification; vocabulary real-time
                 recognizer",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Speech
                 recognition and understanding \\ J.5 Computer
                 Applications, ARTS AND HUMANITIES, Linguistics \\ F.1.2
                 Theory of Computation, COMPUTATION BY ABSTRACT DEVICES,
                 Modes of Computation, Probabilistic computation",
  treatment =    "P Practical",
}

@Article{Merialdo:1988:MDV,
  author =       "Bernard Merialdo",
  title =        "Multilevel Decoding for Very-Large-Size-Dictionary
                 Speech Recognition",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "227--237",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An important concern in the field of speech
                 recognition is the size of the vocabulary that a
                 recognition system is able to support. Large
                 vocabularies introduce difficulties involving the
                 amount of computation the system must perform and the
                 number of ambiguities it must resolve. But, for
                 practical applications in general and for dictation
                 tasks in particular, large vocabularies are required.
                 This paper describes a new organization of the
                 recognition process, Multilevel Decoding (MLD), that
                 allows the system to support a Very-Large-Size
                 Dictionary (VLSD) --- one comprising over 100 000
                 words. With MLD, the effect of dictionary size on the
                 accuracy of recognition can be studied. Recognition
                 experiments using 10 000- and 200 000-word dictionaries
                 are compared. They indicate that recognition using a
                 200 000-word dictionary is more accurate than
                 recognition using a 10 000-word dictionary.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6130 (Speech analysis and processing techniques);
                 C1250C (Speech recognition)",
  classification = "723; 751",
  corpsource =   "IBM, Paris, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "200 000-word dictionary; algorithms; ambiguities;
                 codes, symbolic --- Decoding; computation; decoding;
                 Decoding; dictation tasks; dictionary size; languages;
                 large vocabularies; measurement; Multilevel; multilevel
                 decoding; performance; Recognition; speech; speech
                 recognition; very-large-size-dictionary;
                 very-large-size-dictionary speech recognition;
                 vocabulary",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Speech
                 recognition and understanding",
  treatment =    "P Practical",
}

@Article{Maruyama:1988:JSA,
  author =       "N. Maruyama and M. Morohashi and S. Umeda and E.
                 Sumita",
  title =        "A {Japanese} sentence analyzer",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "238--250",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper presents the design of a broad-coverage
                 Japanese sentence analyzer which can be part of various
                 Japanese processing systems. The sentence analyzer
                 comprises two components: the lexical analyzer and the
                 syntactic analyzer. Lexical analysis, i.e., segmenting
                 a sentence into words, is a formidable problem for a
                 language like Japanese, because it has no explicit
                 delimiters (blanks) between written words. In practical
                 applications, this task is made more difficult by the
                 occurrence of words not listed in a dictionary. We have
                 developed a five-layered knowledge source and used it
                 successfully in the lexical analyzer, resulting in
                 accurate segmentation, even in cases where there are
                 unknown words. The syntactic analyzer has two modules:
                 One consists of an augmented context-free grammar and
                 the PLNLP parser; the other is the dependency structure
                 constructor, which converts the phrase structures to
                 dependency structures. The dependency structures
                 represent various key linguistic relations in a more
                 direct way. The dependency structures have semantically
                 important information such as tense, aspect, and
                 modality, as well as preference scores reflecting
                 relative ranking of parse acceptability.",
  acknowledgement = ack-nhfb,
  classcodes =   "C7820 (Humanities)",
  classification = "721; 723",
  corpsource =   "Tokyo Woman's Christian Univ., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aspect; automata theory; board-coverage; Computational
                 Linguistics; computer metatheory; context-free grammar;
                 delimiters; dependency structure constructor; five-;
                 information retrieval; Japanese processing systems;
                 Japanese sentence analyzer; key; languages; layered
                 knowledge source; lexical analyzer; linguistic
                 relations; linguistics; modality; modules; parse
                 acceptability; pattern recognition systems; PLNLP
                 parser; preference; scores; sentence analyzer;
                 syntactic analyzer; tense",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Text
                 analysis \\ I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Language
                 parsing and understanding",
  treatment =    "A Application; P Practical",
}

@Article{Velardi:1988:CGA,
  author =       "Paola Velardi and Maria Teresa Pazienza and Mario
                 De'Giovanetti",
  title =        "Conceptual graphs for the analysis and generation of
                 sentences",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "251--267",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A system for analyzing and generating Italian texts is
                 under development. Semantic knowledge on word-sense
                 patterns is used to relate the linguistic structure of
                 a sentence to a conceptual representation (a conceptual
                 graph). Conceptual graphs are stored in a database and
                 accessed by a natural-language query\slash answering
                 module. The system analyzes a text supplied by a
                 press-agency-release database. It consists of three
                 modules: a morphological, a syntactic, and a semantic
                 processor. The semantic analyzer uses a conceptual
                 lexicon of word-sense descriptions, currently including
                 about 850 entries. A description is an extended case
                 frame providing the surface semantic patterns (SSP) of
                 a word-sense w. SSPs express both semantic constraints
                 and word-usage information, such as commonly found word
                 patterns, idioms, and metaphoric expressions. SSPs are
                 used by the semantic interpreter to build a conceptual
                 graph of the sentence, which is then accessed by the
                 query-answering and language-generation modules. This
                 paper claims that the SSP approach is viable and
                 necessary to cope with language phenomena in
                 unrestricted domains. Surface patterns are easily
                 acquired inductively from the natural-language corpus
                 rather than deductively from predefined conceptual
                 structures.",
  acknowledgement = ack-nhfb,
  classcodes =   "C4290 (Other computer theory); C6180N (Natural
                 language processing); C7820 (Humanities)",
  classification = "721; 723",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "analysis; automata theory; case frame; computational
                 linguistics; Computational Linguistics; computer
                 graphics; computer metatheory; conceptual graph;
                 conceptual graphs; conceptual lexicon; conceptual
                 representation; database; expressions; extended;
                 generation; graph theory; idioms; Italian texts;
                 knowledge; language phenomena; language query/answering
                 module; languages; linguistic structure; metaphoric;
                 natural languages; natural-; pattern recognition
                 systems; press-agency-release; query languages;
                 query-answering; semantic; semantic constraints;
                 semantic knowledge; semantic processor; sentences;
                 surface semantic patterns; theory; word patterns;
                 word-sense patterns; word-usage information",
  subject =      "I.2.7 Computing Methodologies, ARTIFICIAL
                 INTELLIGENCE, Natural Language Processing, Language
                 generation",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Pignal:1988:AHS,
  author =       "P. I. Pignal",
  title =        "An analysis of hardware and software availability
                 exemplified on the {IBM} 3725 communication
                 controller",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "2",
  pages =        "268--278",
  month =        mar,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Because of the growing commercial, governmental, and
                 scientific requirements for system availability,
                 evaluating this factor has become important. This paper
                 presents a unified approach to hardware and software
                 availability of a system in the operational phase. The
                 aim is to evaluate the availability in a given time
                 interval, to show how to improve it, and to determine
                 the probability that a specified level is met over the
                 period. The inputs are the failure and repair rates of
                 the system elements, and the functional relationship
                 between them. Field tracking provides the failure and
                 repair data, and Markov-chain techniques make it
                 possible to construct, reduce, and solve the model.
                 Availability is computed by the program package System
                 Availability Estimator (SAVE). The model has been used
                 and validated with actual field data for the IBM 3725
                 Communication Controller.",
  acknowledgement = ack-nhfb,
  classcodes =   "C1140Z (Other and miscellaneous); C5470 (Performance
                 evaluation and testing)",
  classification = "722; 723; 731; 732; 913; 922",
  corpsource =   "IBM Commun. Products Div., La Gaude, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "communication controller; computer software ---
                 Reliability; computer systems, digital; control
                 equipment, electric; design; field tracking; functional
                 relationship; hardware and software availability;
                 hardware availability; IBM 3725; IBM computers;
                 Markov-chain; measurement; operational phase;
                 performance; probability; program package; reliability;
                 Reliability; repair rates; software availability;
                 System Availability Estimator; techniques; time
                 interval; verification",
  subject =      "C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ B.4.2 Hardware, INPUT/OUTPUT AND DATA
                 COMMUNICATIONS, Input/Output Devices, Channels and
                 controllers",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Landauer:1988:SVC,
  author =       "R. Landauer",
  title =        "Spatial Variation of Currents and Fields Due to
                 Localized Scatterers in Metallic Conduction",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "306--316",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Volume 1 of this journal included a paper with the
                 above title. Studies of small samples, in recent years,
                 as well as earlier work on disordered samples, have
                 caused some of the content of the earlier work to
                 become widely understood. The aspects stressed in the
                 title, however, relating to the spatial variations in
                 the vicinity of a localized scattering center, have
                 received little attention, except in electromigration
                 theory debates. We return to these aspects of the
                 earlier paper, and emphasize that the transport field
                 associated with a point-defect scattering center is a
                 highly localized dipole field. The nonlinearity of
                 resistance in terms of scattering cross section is
                 discussed. A theory of these effects, which does
                 justice to the coherent multiple-scattering effects
                 present at low temperatures, does not yet exist. Such a
                 theory is likely to modify the effects, but it is
                 unlikely to cause them to disappear. We also discuss
                 closed loops, without leads; the persistent currents
                 expected in these; and a possible method of detecting
                 the persistent currents.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "A7210F (Scattering by point defects, dislocations,
                 surfaces, and other imperfections); A7215Q (Scattering
                 mechanisms and Kondo effect)",
  classification = "531; 701; 704; 711",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "closed loops; coherent multiple-; design; disordered
                 samples; Electric Conductivity; electric conductors;
                 electrical conductivity of solids; electromagnetic
                 waves --- Scattering; electromagnetism; localized
                 dipole field; localized scatterers; localized
                 scattering center; low temperatures; measurement;
                 metallic conduction; metals and alloys; nonlinearity
                 of; persistent currents; point-defect; point-defect
                 scattering center; resistance; scattering center;
                 scattering cross section; scattering effects; spatial;
                 spatial variation; theory; variations",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles \\ J.2 Computer Applications, PHYSICAL SCIENCES
                 AND ENGINEERING, Electronics",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Buttiker:1988:SEC,
  author =       "M. Buttiker",
  title =        "Symmetry of Electrical Conduction",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "317--334",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The resistance of a conductor measures in a four-probe
                 setup is invariant if the exchange of the voltage and
                 current sources is accompanied by a magnetic field
                 reversal. We present a derivation of this theorem. The
                 reciprocity of the resistances is linked directly to
                 the microscopic reciprocity of the S-matrix, which
                 describes reflection at the sample and transmission
                 through the sample. We demonstrate that this symmetry
                 holds for a conductor with an arbitrary number of
                 leads. Since leads act like inelastic scatterers,
                 consideration of a many-probe conductor also implies
                 that the reciprocity of resistances is valid in the
                 presence of inelastic scattering. Various conductance
                 formulas are discussed in the light of the reciprocity
                 theorem. We discuss some implications of our results
                 for the nature of a voltage measurement and point to
                 the difference between chemical potentials and the
                 local electric potential.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "A7210B (General formulation of transport theory)",
  classification = "701; 704; 942",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "arbitrary number of; chemical potentials; conductance
                 formulae; conduction; conduction symmetry;
                 Conductivity; current voltage interchange; current
                 voltage reciprocity; design; electric conductivity ---
                 Theory; electric conductors --- Electric Properties;
                 electric field effects; electric measurements;
                 electrical; electrical conductivity of solids;
                 electronic; four point probe; four-probe setup;
                 inelastic scattering; leads; local electric potential;
                 magnetic field reversal; many-probe conductor;
                 measurement; microscopic reciprocity; reciprocity
                 theorem; S-matrix; theory; voltage",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles \\ G.1.m Mathematics
                 of Computing, NUMERICAL ANALYSIS, Miscellaneous",
  treatment =    "B Bibliography; T Theoretical or Mathematical",
}

@Article{Washburn:1988:FEC,
  author =       "S. Washburn",
  title =        "Fluctuations in the Extrinsic Conductivity of
                 Disordered Metal",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "335--346",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Random fluctuations of the electrical conductance are
                 ubiquitous in small (typical dimension L APP 1STH 1
                 $\mu$ m) metallic samples at low temperatures
                 (typically T APP 1STH 1 K approximately equals 0.09
                 meV). The fluctuations result from the
                 quantum-mechanical interference of the carrier
                 wavefunctions. The superpositions of the wavefunctions
                 depend randomly on the placement of impurities, on
                 magnetic field, and on the current driven through the
                 sample. At length scale $L_\phi$ (the average distance
                 over which the carriers retain phase information), the
                 fluctuations always have amplitude DELTA G@APEQ@e**2/h,
                 and any observations at scale larger than the coherence
                 length yield a decreased amplitude of the fluctuations.
                 Since the carrier wavefunctions are not classical,
                 local objects (they extend over regions of size
                 $L_\phi$), the conductance contains nonlocal terms. For
                 instance, the conductance is not zero far from the
                 classical current paths through the sample and is not
                 symmetric under the reversal of the magnetic field. The
                 physics of the fluctuations is reviewed, and some of
                 the experiments which illuminate the physics are
                 described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "A7200 (Electronic transport in condensed matter)",
  classification = "531; 701; 711; 942",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1 K; 1 micron; carrier wavefunctions; coherence;
                 conductance; conductance fluctuations; current driven;
                 design; disordered metal; Electric Conductivity;
                 electric field effects; electrical conductance;
                 electrical conductivity of solids; electromagnetic
                 waves; experiments; extrinsic conductivity; extrinsic
                 conductivity of disordered metal; fluctuations;
                 impurities; interference; length; localized samples;
                 low temperatures; magnetic field; measurement; metals
                 and alloys; performance; placement of;
                 quantum-mechanical; random fluctuations; small metallic
                 samples; theory",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "B Bibliography; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Kaplan:1988:MCP,
  author =       "S. B. Kaplan and Allan M. Hartstein",
  title =        "Mesoscopic Coherence Phenomena in Semiconductor
                 Devices",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "347--358",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Semiconductor devices have several attractive
                 properties which make them useful in the study of
                 electronic coherence phenomena such as universal
                 conductance fluctuations. The use of gated devices
                 allows the Fermi level, and thus the electronic
                 wavelength, to be adjusted in order to study energy
                 correlation effects. The two-dimensional electron gas
                 formed beneath the gate can be tilted with respect to
                 the magnetic field to reveal that the field correlation
                 length of the fluctuations obeys a cosine law. This
                 suggests that the fluctuations are caused by quantum
                 interference in the same way that the Aharonov--Bohm
                 effect arises in metallic rings. The energy range over
                 which electrons are correlated in these materials is
                 generally larger than in metals. This allows one to
                 study these conductance fluctuations at much higher
                 temperatures than are feasible in metallic conductors.
                 For the same reason, larger source-drain voltages can
                 be applied to observe asymmetry and nonlinear effects
                 in the conductance.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "A7220D (General theory, scattering mechanisms); B2520
                 (Semiconductor theory, materials and properties); B2560
                 (Semiconductor devices)",
  classification = "531; 701; 714; 931; 933",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Aharonov--Bohm effect; design; electrical conductivity
                 of crystalline semiconductors and; electron gas;
                 electronic; electronic coherence phenomena; Electronic
                 Properties; energy correlation effects; Fermi level;
                 field correlation length; field effect transistors;
                 fluctuations; gated devices; insulators; magnetic
                 field; measurement; mesoscopic coherence; mesoscopic
                 coherence phenomena; metallic rings; metals and alloys
                 --- Electronic Properties; nonlinear effects;
                 performance; quantum interference; quantum theory;
                 semiconductor devices; source-drain voltages; theory;
                 two-dimensional; universal conductance; universal
                 conductance fluctuations; wavelength",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  treatment =    "B Bibliography; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Cheung:1988:IRM,
  author =       "Ho-Fai Cheung and Yuval Gefen and Eberhard K. Riedel",
  title =        "Isolated Rings of Mesoscopic Dimensions. Quantum
                 Coherence and Persistent Currents",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "359--371",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Persistent currents in small nonsuperconducting rings
                 threaded by a magnetic flux are a manifestation of
                 novel quantum effects in submicron systems. We present
                 theoretical results for one-channel and multichannel
                 systems concerning the dependence of the current
                 amplitude on the number of channels and geometry,
                 temperature, and degree of disorder. Inelastic
                 scattering is considered for one-channel loops only. We
                 also discuss the observability of the effect.",
  acknowledgement = ack-nhfb,
  affiliation =  "Univ of Washington, Seattle, WA, USA",
  affiliationaddress = "Univ of Washington, Seattle, WA, USA",
  classcodes =   "A7210B (General formulation of transport theory)",
  classification = "701; 711; 714; 931; 942",
  corpsource =   "Dept. of Phys., Washington Univ., Seattle, WA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Aharonov Bohm effect; channels; coherence; degree of
                 disorder; design; effects; electrical conductivity of
                 solids; electromagnetic waves --- Scattering;
                 electromagnetism; geometry; inelastic scattering;
                 isolated rings; magnetic field effects; magnetic flux;
                 magnetic flux threaded rings; magnetoresistance;
                 measurement; mesoscopic dimensions; nonsuperconducting
                 rings; number of; observability; performance;
                 persistent currents; quantum; quantum coherence;
                 quantum theory; small nonsuperconducting rings;
                 submicron systems; temperature; theoretical results;
                 theory",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies \\ G.m Mathematics of Computing,
                 MISCELLANEOUS",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Fowler:1988:ETS,
  author =       "A. B. Fowler and J. J. Wainer and R. A. Webb",
  title =        "Electronic Transport in Small Strongly Localized
                 Structures",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "372--383",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We review some recent results on the low-temperature
                 transport properties (T less than 4 K) of very small
                 silicon metal-oxide field-effect transistors in the
                 insulating regime of conduction. Our devices are
                 lithographically patterned to have widths as small as
                 0.05 $\mu$ m and lengths as short as 0.06 $\mu$ m.
                 These small transistors exhibit new and unexpected
                 sample-specific fluctuation behavior in the gate
                 voltage, temperature, and magnetic field dependence of
                 the conductance. We discuss both resonant tunneling and
                 Mott variable-range hopping, the two main transport
                 mechanisms in these devices at low temperature.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B2520C (Elemental semiconductors); B2530F
                 (Metal-insulator-semiconductor structures); B2560R
                 (Insulated gate field effect transistors)",
  classification = "549; 712; 714; 933",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0; 50 to 60 nm; design; electronic transport;
                 elemental semiconductors; field dependence of
                 conductance; field effect transistors; fluctuation
                 behavior; gate voltage; hopping conduction; insulated
                 gate; insulating; localized structures; low-temperature
                 transport; magnetic; measurement; metal-oxide
                 field-effect transistors; MOSFETs; Mott; Mott
                 variable-range hopping; performance; properties; regime
                 of conduction; resonant tunneling; sample-specific;
                 semiconducting silicon; semiconductor devices, MOSFET;
                 semiconductors; Si; silicon; silicon metal-oxide
                 field-effect transistors; small transistors;
                 temperature; theory; to 4 K; transistors, field effect;
                 transport mechanisms; Transport Properties; tunnelling;
                 variable-range hopping",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies",
  treatment =    "X Experimental",
}

@Article{Stone:1988:WMW,
  author =       "S. Douglas Stone and Aaron Szafer",
  title =        "What is Measured When You Measure a Resistance? ---
                 the {Landauer} Formula Revisited",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "384--413",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We re-examine the question of what constitutes the
                 physically relevant quantum-mechanical expression for
                 the resistance of a disordered conductor in light of
                 recent experimental and theoretical advances in our
                 understanding of the conducting properties of
                 mesoscopic systems. It is shown that in the absence of
                 a magnetic field, the formula proposed by Buttiker,
                 which expresses the current response of a multi-port
                 conductor in terms of transmission matrices, is
                 derivable straightforwardly from linear response
                 theory. We also present a general formalism for solving
                 these equations for the resistance given the scattering
                 matrix. This Landauer-type formula reduces to g equals
                 (e**2/h)Tr(tt** DAGGER), where g is the conductance and
                 t is the transmission matrix, for the two-probe case.
                 It is suggested that this formula provides the best
                 description of the present class of experiments
                 performed in two-probe or multi-probe measuring
                 configurations, and that the subtleties leading to
                 various different Landauer formulas are not relevant to
                 these experiments.",
  acknowledgement = ack-nhfb,
  affiliation =  "Yale Univ, New Haven, CT, USA",
  affiliationaddress = "Yale Univ, New Haven, CT, USA",
  classcodes =   "A0365 (Quantum theory; quantum mechanics); A1220D
                 (Specific calculations and limits of quantum
                 electrodynamics); A7210B (General formulation of
                 transport theory)",
  classification = "701; 704; 931; 942",
  corpsource =   "Dept. of Appl. Phys., Yale Univ., New Haven, CT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "conducting; design; disordered conductor; electric
                 conductors --- Theory; electric measurements; electric
                 resistance; electrical conductivity of solids;
                 electromagnetism; experimentation; general formalism;
                 Landauer formula; Landauer-type formula; measurement;
                 measuring configurations; mechanical expression;
                 multi-port conductor; multi-probe; multi-probe
                 conductors; performance; properties of mesoscopic
                 systems; quantum electrodynamics; quantum theory;
                 quantum-; quantum-mechanical expression; Resistance;
                 scattering matrix; theory; two probe measuring
                 configuration",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Electronics \\ J.2 Computer Applications,
                 PHYSICAL SCIENCES AND ENGINEERING, Physics \\ G.m
                 Mathematics of Computing, MISCELLANEOUS",
  treatment =    "B Bibliography; T Theoretical or Mathematical",
  xxauthor =     "A. D. Stone and A. Szafer",
}

@Article{Kirtley:1988:STM,
  author =       "J. R. Kirtley and S. Washburn and M. J. Brady",
  title =        "Scanning Tunneling Measurements of Potential Steps at
                 Grain Boundaries in the Presence of Current Flow",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "3",
  pages =        "414--418",
  month =        may,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We have used a new technique to simultaneously measure
                 the surface topography and surface potential of
                 current-carrying polycrystalline Au$_{60}$Pd$_{40}$
                 thin films using a scanning tunneling microscope. We
                 find abrupt steps in the surface potential due to
                 scattering from grain boundaries in these films.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "A6116D (Electron microscopy determinations); A7215E
                 (Electrical and thermal conduction in crystalline
                 metals and alloys)",
  classification = "539; 547; 701; 741; 933; 942",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "abrupt; Au/sub 60/Pd/sub 40/ thin films; crystals ---
                 Electric Properties; current carrying film; current
                 flow; design; electric measurements; electrical
                 conductivity of crystalline metals and alloys;
                 experimentation; films --- Microscopic Examination;
                 gold alloys; gold palladium alloys; grain boundaries;
                 measurement; microscopy; palladium alloys; performance;
                 polycrystalline; potential steps; scanning tunneling
                 measurements; scanning tunneling microscope; scanning
                 tunnelling; scattering from grain boundaries;
                 simultaneously measure; steps; surface potential;
                 surface topography; theory; Thin Films",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Physics",
  treatment =    "X Experimental",
}

@Article{Hatzakis:1988:MPM,
  author =       "Michael Hatzakis",
  title =        "Materials and Processes for Microstructure
                 Fabrication",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "441--453",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The fabrication of structures considerably smaller
                 than the devices and circuits that are mass-produced
                 for use in computers and other electronic equipment is
                 the subject of this paper. Devices of <1$\mu$m
                 (microstructures) and <100 nm (nanostructures) minimum
                 dimensions were made possible in a practical sense only
                 after the introduction of electron beams and the
                 associated processes, as lithographic tools in the
                 early 1960s. This paper presents a historical
                 perspective of this very important chapter in
                 lithographic technology, primarily from the point of
                 view of materials and processes. In addition, the
                 important criteria that have to be considered in the
                 fabrication of small structures, with respect to the
                 interaction of the writing beam with the resist
                 material and the substrate, and the subsequent
                 pattern-transferring processes, are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Res. Center",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B2550G (Lithography)",
  classification = "713; 714; 745; B2550G (Lithography)",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "electron beam lithography; Electron beams; electron
                 beams; historical perspective; iii-v compounds;
                 integrated circuit manufacture; Lithographic
                 technology; lithographic technology; lithographic
                 tools; Lithographic tools; lithography; Materials;
                 microelectronics; microstructure fabrication;
                 Microstructure fabrication; Nanostructures;
                 nanostructures; pattern-transferring processes;
                 Pattern-transferring processes; pattern-transferring
                 processes; resist material; Resist material;
                 semiconductor technology; small structures; writing
                 beam; Writing beam; writing beam",
  thesaurus =    "Electron beam lithography; Semiconductor technology",
  treatment =    "P Practical",
}

@Article{Umbach:1988:NHS,
  author =       "Corwin P. Umbach and Alec N. Broers and Roger H. Koch
                 and C. Grant Wilson and Robert B. Laibowitz",
  title =        "Nanolithography with a high-resolution {STEM}",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "454--461",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A high-resolution scanning transmission electron
                 microscope (STEM) with a beam diameter approaching 0.6
                 nm has been adapted for the patterning of complex
                 fine-line nanostructures. An IBM PC XT is used as the
                 pattern generator to direct the scan electronics from a
                 Cambridge Stereoscan 250 which have been interfaced
                 with the scanning coils of the STEM. A study of the
                 ultimate resolution of the newly designed
                 acid-catalyzed resist
                 poly(p-t-butyloxycarbonyloxystyrene) has been carried
                 out. The STEM has proven to be a flexible tool in the
                 fabrication of individual nanostructure devices for
                 quantum transport studies in mesoscopic devices smaller
                 than an electron phase-coherence length.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Res. Center",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B2550G (Lithography)",
  classification = "713; 714; 741; 745; 817; B2550G (Lithography)",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Acid-catalyzed resist; acid-catalyzed resist; beam
                 diameter; Beam diameter; Cambridge; Cambridge
                 Stereoscan 250; complex fine-line; Complex fine-line
                 nanostructures; computers, personal; electron beam
                 lithography; high-resolution stem; high-resolution
                 STEM; High-resolution STEM; IBM PC XT; integrated
                 circuit manufacture; integrated circuit technology;
                 lithography; mesoscopic devices; Mesoscopic devices;
                 mesoscopic devices; microscope; Microscopic
                 Examination; nanolithography; nanostructure devices;
                 Nanostructure devices; nanostructures; Pattern
                 generator; pattern generator; Patterning; patterning;
                 photoresists; Poly(p-t-butyloxycarbonyloxystyrene);
                 poly(p-t-butyloxycarbonyloxystyrene); quantum transport
                 studies; Quantum transport studies; scanning coils;
                 Scanning coils; scanning transmission electron;
                 Scanning transmission electron microscope;
                 scanning-transmission electron microscopy; Stereoscan
                 250",
  thesaurus =    "Electron beam lithography; Integrated circuit
                 technology; Scanning-transmission electron microscopy",
  treatment =    "P Practical",
  xxauthor =     "C. P. Umbach and A. N. Broers and R. H. Koch and C. G.
                 Willson and R. B. Laibowitz",
}

@Article{Chang:1988:NT,
  author =       "T. H. P. Chang and Dieter P. Kern and Ernst Kratschmer
                 and Kim Y. Lee and Hans E. Luhn and Mark A. McCord and
                 Stephen A. Rishton and Yuli Vladimirsky",
  title =        "Nanostructure Technology",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "462--493",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The ability to fabricate structures with lateral
                 dimensions in the sub-100-nm range has opened a new
                 field of research. This paper first reviews recent
                 advances in nanolithography techniques, with a brief
                 discussion of their relative merits and fundamental
                 limits. Special emphasis is given to the scanning
                 electron-beam method, which is the most widely used
                 nanolithography method at the present time. The two
                 main areas of nanostructure research are device
                 technology and basic science. Highlights of a number of
                 exploratory programs in these two areas are
                 presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Res. Center",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "713; 714; 745; 932; B2550G (Lithography); B2570
                 (Semiconductor integrated circuits)",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Basic science; basic science; device; Device
                 technology; electron beam lithography; electron beams;
                 electron-beam method; integrated circuit manufacture;
                 integrated circuit technology; lateral dimensions;
                 Lateral dimensions; lateral dimensions; lithography;
                 nanolithography; nanolithography techniques;
                 Nanolithography techniques; nanostructure;
                 Nanostructure research; nanostructure research;
                 Performance; scanning; scanning electron-beam method;
                 Scanning electron-beam method; technology",
  thesaurus =    "Electron beam lithography; Integrated circuit
                 technology",
  treatment =    "P Practical",
}

@Article{Pfeiffer:1988:HHE,
  author =       "Hans C. Pfeiffer and Timothy R. Groves and Thomas H.
                 Newman",
  title =        "High-throughput, high-resolution electron-beam
                 lithography",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "494--501",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The introduction of the shaped-beam imaging technique
                 has greatly enhanced the exposure efficiency of
                 electron-beam lithography systems. IBM's EL systems
                 provide the throughput needed for lithography
                 applications in semiconductor fabrication lines. The
                 resolution of these systems has been steadily improved
                 over the past 15 years in support of the semiconductor
                 lithography trend toward submicron dimensions. This
                 paper describes the latest version (EL-3 system)
                 capable of fabricating 0.25-$\mu$m features. The
                 technical challenges of submicron e-beam lithography
                 are discussed, and practical solutions together with
                 experimental results are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Gen. Technol. Div.",
  affiliationaddress = "Hopewell Junction, NY, USA",
  classcodes =   "B2550G (Lithography)",
  classification = "713; 714; 745; 932; B2550G (Lithography)",
  corpsource =   "IBM, Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.25 Micron; 0.25 micron; EL-3 system; electron beam
                 lithography; electron beams; electron-beam lithography;
                 exposure efficiency; Exposure efficiency; exposure
                 efficiency; high-resolution; high-resolution
                 electron-beam lithography; High-resolution
                 electron-beam lithography; high-throughput; imaging
                 technique; integrated circuit manufacture; lithography;
                 Performance; Semiconductor fabrication lines;
                 semiconductor fabrication lines; Semiconductor
                 lithography; semiconductor lithography; semiconductor
                 technology; shaped-beam; Shaped-beam imaging technique;
                 shaped-beam imaging technique; submicron dimensions;
                 Submicron dimensions; throughput; Throughput",
  numericalindex = "Size 2.5E-07 m",
  thesaurus =    "Electron beam lithography; Semiconductor technology",
  treatment =    "P Practical; X Experimental",
}

@Article{Broers:1988:RLE,
  author =       "A. N. Broers",
  title =        "Resolution Limits for Electron-Beam Lithography",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "502--513",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper discusses resolution limits for
                 electron-beam fabrication. Electron beams have been
                 used to produce structures 1 nm in size and devices
                 with minimum features of about 20 nm. In all cases the
                 resolution is set primarily by the range of the
                 electron interaction phenomena that form the
                 structures, and not by the size of the electron beam
                 used to write the patterns. The beam can be as small as
                 0.5 nm. Devices built to date have been fabricated with
                 conventional resist processes; these have an ultimate
                 resolution of about 10 nm. Experimental data for PMMA,
                 the highest-resolution electron resist, show that
                 resolution is independent of molecular weight and is
                 therefore not a function of the molecular size. The
                 most promising of the methods offering resolution below
                 10 nm is the direct sublimation of materials such as
                 AlF$_3$ and Al$_2$O$_3$; 1-nm structures have been
                 fabricated. There is the possibility of making devices
                 by direct modification of the electrical properties of
                 conductors, semiconductors, or superconductors by means
                 of high-energy electron bombardment. In these cases no
                 intermediate fabrication process would be used, and it
                 might be possible to reach dimensions comparable to the
                 beam diameter.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. Eng.",
  affiliationaddress = "Cambridge Univ, Cambridge, Engl",
  chemicalindex = "AlF3/int Al/int F3/int F/int AlF3/bin Al/bin F3/bin
                 F/bin; Al2O3/int Al2/int Al/int O3/int O/int Al2O3/bin
                 Al2/bin Al/bin O3/bin O/bin",
  classcodes =   "B2550G (Lithography)",
  classification = "713; 714; 745; 932; B2550G (Lithography)",
  corpsource =   "Dept. of Electr. Eng., Cambridge Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al$_2$O$_3$; Al$_2$O/sub 3/; AlF$_3$; AlF/sub 3/; beam
                 diameter; conventional; Conventional resist processes;
                 direct; direct sublimation; Direct sublimation;
                 electron beam lithography; electron beams; electron
                 bombardment; electron interaction; electron interaction
                 phenomena; Electron interaction phenomena; electron
                 resists; electron-beam fabrication; Electron-beam
                 fabrication; electron-beam lithography; features;
                 integrated circuit manufacture; lithography; minimum;
                 Minimum features; molecular weight; Molecular weight;
                 Performance; PMMA; resist processes; resolution limits;
                 Resolution limits; resolution limits; sublimation",
  thesaurus =    "Electron beam lithography; Electron resists",
  treatment =    "P Practical; X Experimental",
}

@Article{Hohn:1988:AEL,
  author =       "F. J. Hohn and Alan D. Wilson and Philip Coane",
  title =        "Advanced Electron-Beam Lithography for 0.5-$\mu$m to
                 0.25-$\mu$m Device Fabrication",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "514--522",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "High-resolution lithographic capability is required
                 for the fabrication of fully scaled semiconductor
                 devices at minimum dimensions of 0.5 $\mu$ m to 0.25
                 $\mu$ m --- the prototype for the semiconductor logic
                 and memory CMOS devices of the 1990s. Electron-beam
                 exposure tools provide this capability. Fully scaled
                 0.5-$\mu$m test devices were fabricated using a
                 modified EL-3 variable shaped-electron-beam system,
                 while 0.25-$\mu$m ground-rule lithography was
                 accomplished with a Gaussian round-electron-beam Vector
                 Scan system. An important part of this technology is
                 the selection of lithographic resist system and the
                 process used for pattern definition and transfer.
                 Twelve or more lithographic steps are often needed for
                 circuit devices with the above minimum dimensions. For
                 fully scaled applications, each pattern level must be
                 defined by electron-beam lithography, and each level
                 may require a specific lithographic resist.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Res. Center",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "B2570D (CMOS integrated circuits); B2550G
                 (Lithography)",
  classification = "713; 714; 745; 932; B2550G (Lithography); B2570D
                 (CMOS integrated circuits)",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.25 To 0.5 micron; 0.25 to 0.5 micron; CMOS; CMOS
                 device fabrication; CMOS devices; CMOS integrated
                 circuits; device fabrication; Device fabrication;
                 devices; EL-3 variable shaped-electron-beam system;
                 electron beam lithography; electron beams;
                 Electron-beam lithography; electron-beam lithography;
                 fully scaled; Fully scaled semiconductor devices;
                 Gaussian round-electron-beam Vector Scan; Gaussian
                 round-electron-beam Vector Scan system; ground-;
                 Ground-rule lithography; ground-rule lithography;
                 high-resolution; integrated circuit manufacture;
                 integrated circuit technology; lithography; memory;
                 Memory; memory CMOS devices; Pattern definition;
                 pattern definition; Performance; resist; Resist system;
                 resist system; Resist technologies; rule lithography;
                 scaled semiconductor devices; semiconductor devices;
                 Semiconductor logic; semiconductor logic;
                 shaped-electron-beam; system; technologies",
  numericalindex = "Size 2.5E-07 to 5.0E-07 m",
  thesaurus =    "CMOS integrated circuits; Electron beam lithography;
                 Integrated circuit technology",
  treatment =    "P Practical; X Experimental",
}

@Article{Kienzle:1988:APS,
  author =       "M. G. Kienzle and Juan A. Garay and William H.
                 Tetzlaff",
  title =        "Analysis of page-reference strings of an interactive
                 system",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "523--535",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The performance of real-storage-management algorithms
                 in interactive systems suggests that locality of
                 reference extends to a significant degree across users'
                 transactions. This paper investigates this locality of
                 reference by analyzing page-reference strings gathered
                 from live systems. The data confirm the supposition:
                 They suggest that reference patterns are dominated by
                 system data references that are implied by the user's
                 commands. Program references appear to play only a
                 minor role. The user command sequence is an important
                 factor in the reference behavior of an interactive
                 session.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Thomas J. Watson Res. Center",
  affiliationaddress = "IBM, Yorktown Heights, NY, USA",
  classcodes =   "C6150J (Operating systems); C6120 (File
                 organisation)",
  classification = "721; 722; 723; C6120 (File organisation); C6150J
                 (Operating systems)",
  corpsource =   "IBM, Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer programming; computer systems, digital; data
                 references; data storage, digital; Interactive
                 Operation; Interactive session; interactive session;
                 interactive system; Interactive system; interactive
                 systems; live systems; Live systems; locality of
                 reference; management; management algorithms; operating
                 systems (computers); page-reference strings;
                 Page-reference strings; real-storage-;
                 Real-storage-management algorithms; Reference patterns;
                 reference patterns; sequence; storage; System data
                 references; system data references; user command; user
                 command sequence; User command sequence; users'
                 transactions; Users' transactions; users' transactions;
                 virtual storage",
  thesaurus =    "Interactive systems; Operating systems [computers];
                 Storage management; Virtual storage",
  treatment =    "P Practical",
}

@Article{Vassiliadis:1988:PEA,
  author =       "Stamatis Vassiliadis and Michael Putrino and Eric M.
                 Schwarz",
  title =        "Parallel Encrypted Array Multipliers",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "536--551",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "An algorithm for direct two's-complement and
                 sign-magnitude parallel multiplication is described.
                 The partial product matrix representing the
                 multiplication is converted to an equivalent matrix by
                 encryption. Its reduction, producing the final result,
                 needs no specialized adders and can be added with any
                 parallel array addition technique. It contains no
                 negative terms and no extra `correction' rows; in
                 addition, it produces the multiplication with fewer
                 than the minimal number of rows required for a direct
                 multiplication process.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Syst. Products Div.",
  affiliationaddress = "IBM, Endicott, NY, USA",
  classcodes =   "C5230 (Digital arithmetic methods)",
  classification = "721; 723; 921; C5230 (Digital arithmetic methods)",
  corpsource =   "IBM, Syst. Products Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "computer metatheory; computers, digital; cryptography;
                 digital arithmetic; direct multiplication; Direct
                 two's-complement; direct two's-complement; encrypted
                 array; Encryption; encryption; equivalent matrix;
                 Equivalent matrix; mathematical techniques --- Matrix
                 Algebra; matrix algebra; multiplication; Multiplying
                 Circuits; parallel array addition; Parallel array
                 addition technique; parallel array addition technique;
                 parallel multiplication; partial product matrix;
                 Partial product matrix; product matrix; sign-magnitude
                 parallel; Sign-magnitude parallel multiplication;
                 two's-complement",
  thesaurus =    "Cryptography; Digital arithmetic; Matrix algebra",
  treatment =    "P Practical",
}

@Article{DiZenzo:1988:MLA,
  author =       "Silvano {Di Zenzo}",
  title =        "A many-valued logic for approximate reasoning",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "4",
  pages =        "552--565",
  month =        jul,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new system of many-valued logic, the extended post
                 system of order p, P greater than equivalent to 2, is
                 proposed as a system of logic supporting reasoning with
                 facts and rules which are reliable to a specified
                 extent. In an extended post system there are as many
                 operations of logical disjunction and logical
                 conjunction as there are truth values. The truth value
                 associated with a particular operation of disjunction
                 (conjunction) acts as a threshold value controlling the
                 behavior of the operation. The availability of an
                 extended set of logical operations provides improved
                 flexibility in the symbolic translation of sentences
                 from the ordinary word-language. Extended post systems
                 are equipped with a semantics in which graded rather
                 than crisp sets correspond to predicates. The system
                 exhibits a `rich' algebraic structure. The p operations
                 of disjunction form a distributivity cycle. To each
                 disjunction there corresponds a dual operation of
                 conjunction, the two operations being distributive to
                 one another. The p conjunctions form a dual
                 distributivity cycle.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Italy",
  affiliationaddress = "IBM Italy, Rome, Italy",
  classcodes =   "C1230 (Artificial intelligence); C4210 (Formal
                 logic)",
  classification = "721; 723; C1230 (Artificial intelligence); C4210
                 (Formal logic)",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approximate reasoning; Approximate reasoning;
                 approximate reasoning; artificial intelligence;
                 automata theory; computer metatheory; Extended Post;
                 Extended Post system; extended post system; Facts;
                 facts; knowledge engineering; logic design; Logical
                 conjunction; logical conjunction; Logical disjunction;
                 logical disjunction; logics; Many Valued Logics;
                 many-valued; many-valued logic; Many-valued logic;
                 Predicates; predicates; Reasoning; reasoning; rules;
                 Rules; semantics; Semantics; symbolic; Symbolic
                 translation; system; threshold value; Threshold value;
                 translation; truth value; truth values; Truth values;
                 word-language",
  thesaurus =    "Artificial intelligence; Knowledge engineering;
                 Many-valued logics",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Leidheiser:1988:ITT,
  author =       "Henry {Leidheiser, Jr.} and Richard D. Granata",
  title =        "Ion transport through protective polymeric coatings
                 exposed to an aqueous phase",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "582--590",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Protective polymeric coatings for metal and electrical
                 component surfaces are designed primarily to serve as
                 barriers for environmental constituents such as water,
                 oxygen and other atmospheric gases, and ions. The paper
                 describes the status of work in the laboratory to
                 develop an improved understanding of the chemical and
                 physical aspects of ion transport through polymeric
                 coatings which are exposed to an aqueous phase. The
                 ion-transport process may occur in the absence or
                 presence of an externally applied potential. Three
                 aspects of ion transport are discussed: methods used in
                 the laboratory to measure ion transport; the morphology
                 of polymeric coatings as related to ion transport; and
                 the chemical nature of an ion in a coating.",
  acknowledgement = ack-nhfb,
  affiliation =  "Lehigh Univ., Bethlehem, PA, USA",
  classcodes =   "A6630J (Diffusion, migration, and displacement of
                 impurities)A8160 (Corrosion, oxidation, etching, and
                 other surface treatments)",
  classification = "A6630J (Diffusion, migration, and displacement of
                 impurities); A8160 (Corrosion, oxidation, etching, and
                 other surface treatments)",
  corpsource =   "Lehigh Univ., Bethlehem, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Aqueous phase; aqueous phase; chemical aspects;
                 Chemical aspects; coatings; design; diffusion in
                 solids; Electrical component surfaces; electrical
                 component surfaces; ion mobility; Ion-transport
                 process; ion-transport process; measurement; Metal
                 surface; metal surface; morphology; Morphology,
                 performance; Physical aspects; physical aspects;
                 polymer films; protective; protective polymeric;
                 Protective polymeric coatings",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Engineering",
  thesaurus =    "Diffusion in solids; Ion mobility; Polymer films;
                 Protective coatings",
  treatment =    "X Experimental",
}

@Article{OSullivan:1988:CPC,
  author =       "Eugene J. M. O'Sullivan and Jean Horkans and James R.
                 White and Judith M. Roldan",
  title =        "Characterization of {PdSn} catalysts for electroless
                 metal deposition",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "591--602",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A set of electrochemical techniques has been developed
                 to measure the component concentrations and the
                 catalytic activity of the PdSn seeder solutions used to
                 activate insulating substrates for the electroless
                 deposition of Cu. The concentration of Sn(II) was
                 calculated from the limiting current for Sn(II)
                 oxidation, that of Sn(IV) from the difference between
                 the Sn metal-deposition limiting current and the Sn(II)
                 limiting current. The palladium concentration was
                 determined by a stripping analysis after Pd deposition
                 from an oxidized seeder solution. The catalytic
                 activity of the PdSn catalyst was estimated by
                 measuring its activity for the electro-oxidation of
                 formaldehyde (the reducing agent used in the
                 electroless Cu bath) or by the cyclic voltammetric
                 response of a seeded electrode in an inert electrolyte.
                 The cyclic voltammetric technique and transmission
                 electron microscopy examination were used to evaluate
                 various accelerating solutions used to increase the
                 activity of the seeder.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cu/el; PdSn/bin Pd/bin Sn/bin",
  classcodes =   "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8265J (Heterogeneous catalysis at
                 surfaces and other surface reactions); A8245
                 (Electrochemistry and electrophoresis)",
  classification = "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8245 (Electrochemistry and
                 electrophoresis); A8265J (Heterogeneous catalysis at
                 surfaces and other surface reactions)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "alloys; Catalyst; catalyst; catalysts; catalytic
                 activity; Catalytic activity; coatings; Component
                 concentrations; component concentrations; copper; Cu
                 deposition; cyclic voltammetric response; Cyclic
                 voltammetric response; design, Electroless metal
                 deposition; Electro-oxidation; electro-oxidation;
                 Electrochemical techniques; electrochemical techniques;
                 electrochemistry; electrode; electroless deposited;
                 electroless deposition; electroless metal deposition;
                 experimentation; formaldehyde; Formaldehyde; inert
                 electrolyte; Inert electrolyte; insulating; Insulating
                 substrates; materials; measurement; microscopy;
                 palladium alloys; PdSn seeder solutions; performance;
                 seeded; Seeded electrode; Stripping analysis; stripping
                 analysis; substrates; tin; transmission electron;
                 transmission electron microscope examination of;
                 Transmission electron microscopy",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Engineering \\ J.2 Computer Applications,
                 PHYSICAL SCIENCES AND ENGINEERING, Electronics",
  thesaurus =    "Catalysts; Copper; Electrochemistry; Electroless
                 deposited coatings; Electroless deposition; Palladium
                 alloys; Tin alloys; Transmission electron microscope
                 examination of materials",
  treatment =    "X Experimental",
}

@Article{Kovac:1988:CAI,
  author =       "C. A. Kovac and J. L. Jordan-Sweet and M. J. Goldberg
                 and J. G. Clabes and A. Viehbeck and R. A. Pollak",
  title =        "Chemistry at interfaces: Electropositive metals on
                 polymer surfaces",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "603--615",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper presents a study of chemical interactions
                 between polymer surfaces and metal atoms deposited from
                 the vapor phase. Such interactions may play an
                 important role in interfacial metal-polymer adhesion.
                 The chemical nature of the interface formed when an
                 electropositive metal (chromium or cesium) is deposited
                 onto the surface of PMDA-ODA polyimide has been
                 investigated using chemical model studies coupled with
                 photoelectron spectroscopic techniques. X-ray
                 photoelectron spectroscopy,
                 synchrotron-radiation-excited core-level photoemission,
                 and near-edge X-ray absorption spectroscopy were used
                 to analyze changes in polymer surfaces during
                 deposition of chromium and cesium. Chemical model
                 studies using cyclic voltammetry and UV-visible
                 spectroscopy were performed using several simpler
                 polymers or monomeric model compounds which contained
                 structural subunits of the polyimide. Results of these
                 experiments show that chromium (and other
                 electropositive metals studied so far) initially reacts
                 rapidly with the carbonyl groups of polyimide, causing
                 reduction of the dianhydride portion of the polymer,
                 with concomitant chromium oxidation. Continued
                 deposition of chromium onto the reacted polymer surface
                 results in the formation of chromium carbide, oxide,
                 and nitride species, indicating a disruption of the
                 polymer chemical structure.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cr/int Cr/el; Cs/int Cs/el",
  classcodes =   "A8265J (Heterogeneous catalysis at surfaces and other
                 surface reactions); A8280D (Electromagnetic radiation
                 spectrometry); A8115 (Methods of thin film deposition);
                 A8280P (Electron spectroscopy for chemical analysis
                 (photoelectron, Auger spectroscopy, etc.)); A8190
                 (Other topics in materials science); A8160J (Polymers
                 and plastics); A8280F (Electrochemical methods)",
  classification = "A8115 (Methods of thin film deposition); A8160J
                 (Polymers and plastics); A8190 (Other topics in
                 materials science); A8265J (Heterogeneous catalysis at
                 surfaces and other surface reactions); A8280D
                 (Electromagnetic radiation spectrometry); A8280F
                 (Electrochemical methods); A8280P (Electron
                 spectroscopy for chemical analysis (photoelectron,
                 Auger spectroscopy, etc.))",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; analysis; caesium; carbonyl groups; Carbonyl
                 groups; chemical interactions; Chemical interactions;
                 chemical model; Chemical model; chromium; Cr; Cs;
                 cyclic voltammetry; Cyclic voltammetry; design, Vapour
                 phase deposition; excited core-level photoemission;
                 experimentation; interfacial metal-polymer adhesion;
                 Interfacial metal-polymer adhesion; measurement; metal
                 atoms; Metal atoms; monomeric model compounds;
                 Monomeric model compounds; near-edge X-ray absorption;
                 Near-edge X-ray absorption spectroscopy; performance;
                 photoelectron spectroscopic techniques; Photoelectron
                 spectroscopic techniques; PMDA-ODA polyimide; polymer
                 chemical; Polymer chemical structure; polymer surfaces;
                 Polymer surfaces; polymers; ray photoelectron
                 spectroscopy; spectrochemical; spectroscopy; structure;
                 surface chemistry; synchrotron-radiation-;
                 Synchrotron-radiation-excited core-level photoemission;
                 thin metal film deposition; Thin metal film deposition;
                 UV-visible spectroscopy; vapour deposited coatings;
                 vapour phase deposition; voltammetry (chemical
                 analysis); X-; X-ray photoelectron spectra; X-ray
                 photoelectron spectroscopy",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Chemistry \\ J.2 Computer Applications,
                 PHYSICAL SCIENCES AND ENGINEERING, Engineering",
  thesaurus =    "Adhesion; Caesium; Chromium; Polymers; Spectrochemical
                 analysis; Surface chemistry; Vapour deposited coatings;
                 Voltammetry [chemical analysis]; X-ray photoelectron
                 spectra",
  treatment =    "X Experimental",
}

@Article{Gotro:1988:CBT,
  author =       "Jeffrey T. Gotro and Bernd K. Appelt",
  title =        "Characterization of a bis-maleimide triazine resin for
                 multilayer printed circuit boards",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "616--625",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The thermosetting resin investigated in this study was
                 a mixture of bis-maleimide and bis-cyanate, frequently
                 referred to as BT (bis-maleimide triazine). For printed
                 circuit board applications, a brominated epoxy resin
                 was blended with BT to impart flame resistance. Resin
                 curing was extensively investigated using a combination
                 of thermoanalytical techniques (thermal analysis,
                 heated-cell infrared spectroscopy, dynamic mechanical
                 analysis, and microdielectrometry). Differential
                 scanning calorimetry indicated a minimum of two
                 separate reactions. Fourier-transform infrared
                 spectroscopy provided more detailed information on the
                 cross-linking reactions during the curing. The onset of
                 cyclotrimerization was found to appear at 150 degrees
                 C, correlating with one of the peaks observed in the
                 differential scanning calorimetry measurements. Dynamic
                 mechanical methods were used to investigate the
                 viscosity profile during simulated lamination
                 temperature profiles. Microdielectrometry performed
                 simultaneously with parallel-plate rheometry provided
                 further insight into the physical changes that occur
                 during lamination.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Systems Technol. Div., Endicott, NY, USA",
  classcodes =   "B0560 (Polymers and plastics); B2210 (Printed
                 circuits)",
  classification = "B0560 (Polymers and plastics); B2210 (Printed
                 circuits)",
  corpsource =   "IBM Systems Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "150 C; analysis; Bismaleimide triazine resin;
                 bismaleimide triazine resin; Brominated epoxy resin;
                 brominated epoxy resin; circuit boards; cross-linking
                 reactions; Cross-linking reactions; cyclotrimerization;
                 Cyclotrimerization; design, Differential scanning
                 calorimetry; dielectric; Dielectric loss; dielectric
                 losses; differential scanning calorimetry; dynamic;
                 Dynamic mechanical analysis; Dynamic mechanical method;
                 experimentation; flame resistance; Flame resistance;
                 Fourier-transform; Fourier-transform infrared
                 spectroscopy; glass transition (polymers); glass
                 transition temperature; Glass transition temperature;
                 heated-cell infrared spectroscopy; Heated-cell infrared
                 spectroscopy; infrared spectroscopy; lamination;
                 Lamination; loss; measurement; mechanical analysis;
                 mechanical method; Microdielectrometry;
                 microdielectrometry; multilayer printed; Multilayer
                 printed circuit boards; Parallel-plate rheometry;
                 parallel-plate rheometry; performance; polymers;
                 printed circuits; Resin curing; resin curing; simulated
                 lamination; Simulated lamination temperature profiles;
                 spectrochemical analysis; temperature profiles;
                 thermal; Thermal analysis; thermoanalytical techniques;
                 Thermoanalytical techniques; Thermosetting resin;
                 thermosetting resin; viscosity; viscosity profile;
                 Viscosity profile",
  numericalindex = "Temperature 4.23E+02 K",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Dielectric losses; Glass transition [polymers];
                 Polymers; Printed circuits; Spectrochemical analysis;
                 Thermal analysis; Viscosity",
  treatment =    "X Experimental",
}

@Article{Ruoff:1988:IAC,
  author =       "Arthur L. Ruoff and Edward J. Kramer and Che-Yu Li",
  title =        "Improvement of adhesion of copper on polyimide by
                 reactive ion-beam etching",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "626--630",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors describe the effect of oxygen-reactive
                 ion-beam etching of a polyimide film to enhance its
                 adhesion to an overlying, subsequently deposited copper
                 film. The adhesion strength of the copper to the
                 polyimide could be increased by as much as a factor of
                 25 as a result of the etching. Near the etching
                 condition which resulted in optimum strength, the
                 failure mode at the polyimide/copper interface changed
                 from adhesive failure to tensile failure. The latter
                 occurred at the `roots' of a `grass-like' surface
                 structure of the ion-etched polyimide film.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
                 NY, USA",
  chemicalindex = "O/el; Cu/int Cu/el",
  classcodes =   "A8190 (Other topics in materials science); A8280D
                 (Electromagnetic radiation spectrometry); A8160J
                 (Polymers and plastics)",
  classification = "A8160J (Polymers and plastics); A8190 (Other topics
                 in materials science); A8280D (Electromagnetic
                 radiation spectrometry)",
  corpsource =   "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; Adhesion strength; adhesion strength;
                 adhesive; Adhesive failure; Composition analysis;
                 composition analysis; copper; Cu; Cu film; design,
                 Scanning electron microscopy; experimentation; failure;
                 failure mode; Failure mode; film; measurement; O
                 reactive ion beam etching; performance; polyimide film;
                 Polyimide film; polymers; scanning electron microscopy;
                 spectrochemical analysis; spectroscopy; sputter
                 etching; Surface morphology; surface morphology;
                 tensile failure; Tensile failure; tensile strength;
                 X-ray photoemission; X-ray photoemission spectroscopy",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Adhesion; Copper; Polymers; Spectrochemical analysis;
                 Sputter etching; Tensile strength",
  treatment =    "X Experimental",
}

@Article{Ruoff:1988:DDP,
  author =       "Arthur L. Ruoff and Edward J. Kramer and Che-Yu Li",
  title =        "Developer-induced debonding of photoresist from
                 copper",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "631--635",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors describe the debonding of a polymeric
                 photoresist film bonded to a thin copper substrate as a
                 result of the diffusion of an organic penetrant into
                 the polymer. The diffusion profile (measured by
                 Rutherford backscattering spectroscopy) consisted of a
                 uniformly swollen layer behind a sharp front which
                 propagated into the polymer at a uniform velocity.
                 Debonding always occurred when the front had penetrated
                 about 12$\mu$m into the polymer (about 1/5 its
                 thickness). The debonding was driven by the release of
                 elastic strain energy created by the swelling.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
                 NY, USA",
  chemicalindex = "Cu/sur Cu/el",
  classcodes =   "B2550G (Lithography)",
  classification = "B2550G (Lithography)",
  corpsource =   "Dept. of Mater. Sci. and Eng., Cornell Univ., Ithaca,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "12 Micron; 12 micron; Cu substrate; design, Developer
                 induced debonding; developer induced debonding;
                 diffusion; Diffusion profile; elastic; Elastic strain
                 energy release; experimentation; measurement; Organic
                 developer; organic developer; performance;
                 photoresists; polymeric photoresist film; Polymeric
                 photoresist film; polymers; profile; Rutherford
                 backscattering; Rutherford backscattering spectroscopy;
                 strain energy release; swelling; Swelling; swelling",
  numericalindex = "Size 1.2E-05 m",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Photoresists; Polymers; Rutherford backscattering;
                 Swelling",
  treatment =    "X Experimental",
}

@Article{Pease:1988:PLU,
  author =       "R. F. Pease and O.-K. Kwon",
  title =        "Physical limits to the useful packaging density of
                 electronic systems",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "636--646",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Increasing the density of electronic circuits and
                 systems has been a major thrust for many years; the
                 benefits are increased speed, reduced power-delay
                 product, and reduced cost. Most of this effort has been
                 directed toward the chip, but during the last decade
                 system performance has been increasingly limited by
                 packaging, and so emphasis has been shifting in that
                 direction. Initially it was believed that heat
                 dissipation was a serious fundamental limit, but
                 advances in heat-sink technology have effectively
                 eliminated that concern. One of the most serious
                 problems is signal distribution. Although one can
                 fabricate submicron metal lines, such lines are not
                 normally practical as chip-to-chip interconnections
                 because their resistance leads to undue signal delay
                 and distortion; increasing their aspect ratio will
                 increase cross talk. It is not clear what constitutes
                 an optimal configuration, but for metals at room
                 temperature a signal-line pitch of 30 to 40$\mu$m
                 appears practical. For low temperatures, and especially
                 for superconducting lines, the pitch could be made very
                 much finer, leading to greatly improved system
                 density.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. Eng., Stanford Univ., CA, USA",
  classcodes =   "B0170J (Product packaging); B2570 (Semiconductor
                 integrated circuits)",
  classification = "B0170J (Product packaging); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "Dept. of Electr. Eng., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "30 to 40 micron; 30 To 40 micron; aspect; Aspect
                 ratio; chip-; Chip-to-chip interconnections; design,
                 Electronic circuit density; dissipation; distortion;
                 Distortion; electronic circuit density; heat; Heat
                 dissipation; heat sinks; heat-sink technology;
                 Heat-sink technology; integrated circuit technology;
                 measurement; optimal configuration; Optimal
                 configuration; packaging; packaging density; Packaging
                 density; performance; ratio; signal delay; Signal
                 delay; signal distribution; Signal distribution;
                 signal-line pitch; Signal-line pitch; superconducting
                 lines; Superconducting lines; to-chip interconnections;
                 VLSI",
  numericalindex = "Size 3.0E-05 to 4.0E-05 m",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Heat sinks; Integrated circuit technology; Packaging;
                 VLSI",
  treatment =    "P Practical",
}

@Article{Chang:1988:EDS,
  author =       "C. S. Chang",
  title =        "Electrical design of signal lines for multilayer
                 printed circuit boards",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "647--657",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Key aspects of the electrical design of signal lines
                 for multilayer printed circuit boards used in computers
                 are examined. Illustrative calculations are carried out
                 for several signal-line configurations, and associated
                 means are presented for selecting design trade-offs
                 regarding cross talk and skin-effect-induced delay.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Syst. Technol. Div., Endicott, NY, USA",
  classcodes =   "B2210B (Printed circuit layout and design)",
  classification = "B2210B (Printed circuit layout and design)",
  corpsource =   "IBM Syst. Technol. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computers; Computers; cross talk; Cross talk; design,
                 Electrical design; effect-induced delay; electrical
                 design; measurement; multilayer printed circuit boards;
                 Multilayer printed circuit boards; performance; printed
                 circuit design; signal-line configurations; Signal-line
                 configurations; skin-; Skin-effect-induced delay",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Printed circuit design",
  treatment =    "P Practical",
}

@Article{Ho:1988:DBA,
  author =       "P. S. Ho and B. D. Silverman and R. A. Haight and R.
                 C. White and P. N. Sanda and A. R. Rossi",
  title =        "Delocalized bonding at the metal-polymer interface",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "658--668",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper summarizes the current understanding of the
                 nature of the chemical bond formed at the interface
                 between a deposited metal atom and an underlying
                 polyimide surface. The approach in these studies is
                 based on the use of quantum chemical calculations to
                 interpret photoemission spectroscopy results. By
                 focusing on the initial reaction between a chromium
                 atom and the PMDA-ODA polyimide repeat unit, the
                 bonding is demonstrated to be delocalized, arising from
                 the formation of a charge-transfer complex between the
                 metal atom and the PMDA unit of the polyimide.
                 Stabilization of the complex involves the transfer of
                 electronic charge from the metal d states of chromium
                 to the lowest unoccupied molecular orbital of the pi
                 system of the PMDA unit of the polyimide. The complex
                 proposed is energetically favored over that involving a
                 direct local interaction between the chromium atom and
                 one of the carbonyl functional groups. The distribution
                 of single-particle electron energy levels deduced from
                 molecular-orbital calculations can account for the
                 spectroscopy results. The formation of such delocalized
                 metal-polymer complexes is also inferred from a related
                 study of the chromium/PMDA-PDA interface.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cr/int Cr/el",
  classcodes =   "A7320J (Delocalization processes); A7960G (Composite
                 surfaces); A3120 (Specific calculations and results);
                 A3520G (Bond strengths, dissociation energies, hydrogen
                 bonding)",
  classification = "A3120 (Specific calculations and results); A3520G
                 (Bond strengths, dissociation energies, hydrogen
                 bonding); A7320J (Delocalization processes); A7960G
                 (Composite surfaces)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bonds (chemical); calculations; carbonyl functional
                 groups; Carbonyl functional groups; charge-transfer
                 complex; Charge-transfer complex; chemical bond;
                 Chemical bond; chromium; Cr; Cr-PMDA-PDA interface;
                 delocalised bonding; delocalized metal-polymer
                 complexes; Delocalized metal-polymer complexes; design,
                 Single particle electron energy level distribution
                 delocalised bonding; direct local; Direct local
                 interaction; interaction; interface electron states;
                 measurement; molecular orbitals calculations;
                 molecular-orbital; Molecular-orbital calculations;
                 performance; photoelectron spectra; photoemission;
                 Photoemission spectroscopy; pi system; Pi system;
                 PMDA-ODA polyimide; PMDA-ODA-; PMDA-ODA-Cr; polymers;
                 quantum chemical calculations; Quantum chemical
                 calculations; single particle electron energy level
                 distribution; spectroscopy; ultraviolet; unoccupied
                 molecular orbital; Unoccupied molecular orbital; UV
                 photoemission spectroscopy; X-ray photoelectron
                 spectra; X-ray photoelectron spectroscopy",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics",
  thesaurus =    "Bonds [chemical]; Chromium; Interface electron states;
                 Molecular orbitals calculations; Polymers; Ultraviolet
                 photoelectron spectra; X-ray photoelectron spectra",
  treatment =    "X Experimental",
}

@Article{Auerbach:1988:SAC,
  author =       "D. J. Auerbach and C. R. Brundle and D. C. Miller",
  title =        "Surface analysis and characterization of large
                 printed-circuit-board circuitization process steps",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "669--681",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors describe the use of surface-analysis
                 techniques to characterize problems encountered in
                 1980-1981 in the fabrication of large printed circuit
                 boards for the IBM 3081 processor unit. XPS, AES, SAM,
                 SEM, and optical microscopy techniques were used. The
                 two major areas addressed were (a) corrosion at a
                 photoresist/Cu foil interface during electroless Cu
                 plating of circuit lines which resulted in defects in
                 subsequently formed Cu lines, and (b) surface-chemical
                 aspects of a `single-seed' colloidal Pd/Sn catalytic
                 initiation of electroless Cu plating onto epoxy
                 surfaces. The corrosion mechanism responsible for the
                 line defects was identified, and corrective actions
                 suggested. Changes in surface composition (Pd/Sn
                 ratio), and surface chemical state (Pd$^0$Pd$^{2+}$,
                 Sn$^0$Sn$^{2+,4+}$) as a function of process step were
                 correlated with plating effectiveness and led to a
                 means of increasing the surface Pd$^0$Sn ratio by as
                 much as an order of magnitude.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  chemicalindex = "Cu/int Cu/el; PdSn/bin Pd/bin Sn/bin",
  classcodes =   "B2210D (Printed circuit manufacture)",
  classification = "B2210D (Printed circuit manufacture)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AES; aspects; Auger effect; chemical state; circuit
                 lines; Circuit lines; corrosion; Corrosion; Cu; design,
                 Pd/Sn ratio; electroless Cu plating; Electroless Cu
                 plating; epoxy surfaces; Epoxy surfaces;
                 experimentation; IBM 3081; IBM 3081 processor unit;
                 large printed-circuit-board circuitization; Large
                 printed-circuit-board circuitization process steps;
                 measurement; optical microscopy; Optical microscopy
                 techniques; Pd/Sn ratio; PdSn catalyst; performance;
                 photoelectron spectra; photoresist/Cu foil interface;
                 Photoresist/Cu foil interface; photoresists; plating
                 effectiveness; Plating effectiveness; printed circuit
                 manufacture; process steps; processor unit; SAM;
                 scanning electron microscopy; SEM; surface; Surface
                 chemical state; surface composition; Surface
                 composition; surface structure; surface-analysis
                 techniques; Surface-analysis techniques;
                 surface-chemical; Surface-chemical aspects; techniques;
                 X-ray; X-ray chemical analysis; XPS",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Electronics \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS",
  thesaurus =    "Auger effect; Corrosion; Optical microscopy;
                 Photoresists; Printed circuit manufacture; Scanning
                 electron microscopy; Surface structure; X-ray chemical
                 analysis; X-ray photoelectron spectra",
  treatment =    "X Experimental",
}

@Article{Berry:1988:EVB,
  author =       "B. S. Berry and W. C. Pritchet",
  title =        "Elastic and viscoelastic behavior of a magnetic
                 recording tape",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "5",
  pages =        "682--694",
  month =        sep,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The mechanical behavior of a trilayer Mylar-based
                 magnetic recording tape has been studied by three
                 complementary methods, applied either to the complete
                 tape or to samples prepared by the selective removal of
                 its front or back coatings. One method provided tensile
                 stress-strain and creep data, another exploited the
                 phenomenon of thermal curling, and a third or mandrel
                 method was used to measure relaxation and recovery in
                 simple bending. Despite the large relative thickness of
                 the Mylar substrate, both the initial stiffness and
                 subsequent relaxation behavior of the tape were
                 strongly influenced by the surface magnetic coatings,
                 and particularly by the oriented and calendered
                 frontcoat, which exhibited elastic anisotropy and an
                 enhanced longitudinal Young's modulus of up to five
                 times that of the Mylar core. As a consequence, the
                 magnetically active frontcoat emerged as the most
                 highly stressed component of the tape, and initially
                 supported almost half of an imposed tensile load. The
                 high initial modulus of the oriented and calendered
                 frontcoat was attributed to the reinforcement provided
                 by the magnetic oxide dispersed in the polymeric
                 frontcoat binder. The substantial viscoelastic behavior
                 of the coatings was also linked to their composite
                 structure, and specifically to the ability of the
                 binder to relax the enhanced initial modulus conferred
                 by the presence of the oxide.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  classcodes =   "B3120B (Magnetic recording); B0560 (Polymers and
                 plastics); B0590 (Materials testing)",
  classification = "B0560 (Polymers and plastics); B0590 (Materials
                 testing); B3120B (Magnetic recording)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "behavior; creep; creep data; Creep data; design;
                 elastic anisotropy; Elastic anisotropy; enhanced
                 longitudinal Young's modulus; Enhanced longitudinal
                 Young's modulus; initial stiffness; Initial stiffness;
                 magnetic anisotropy; magnetic tapes; mandrel; Mandrel
                 method; measurement; mechanical; Mechanical behavior;
                 method; Mylar substrate; polymer films; polymer
                 substrate; Polymer substrate; relaxation; Relaxation
                 behavior; surface magnetic coatings; Surface magnetic
                 coatings; tensile load; Tensile load, performance;
                 tensile strength; tensile stress-strain; Tensile
                 stress-strain; thermal curling; Thermal curling;
                 trilayer Mylar-based magnetic recording tape; Trilayer
                 Mylar-based magnetic recording tape; viscoelastic
                 behavior; Viscoelastic behavior; viscoelasticity;
                 Young's modulus",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Engineering \\ J.2 Computer Applications,
                 PHYSICAL SCIENCES AND ENGINEERING, Electronics",
  thesaurus =    "Creep; Magnetic anisotropy; Magnetic tapes; Polymer
                 films; Tensile strength; Viscoelasticity; Young's
                 modulus",
  treatment =    "X Experimental",
}

@Article{Pennebaker:1988:OBP,
  author =       "William B. Pennebaker and Joan L. Mitchell and Glen G.
                 {Langdon, Jr.} and Ronald B. Arps",
  title =        "An overview of the basic principles of the {Q}-coder
                 adaptive binary arithmetic coder",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "717--726 (or 206--211??)",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Q-Coder is a new form of adaptive binary
                 arithmetic coding. The binary arithmetic coding part of
                 the technique is derived from the basic concepts
                 introduced by Rissanen, Pasco, and Langdon, but extends
                 the coding conventions to resolve a conflict between
                 optimal software and hardware implementations. In
                 addition, a robust form of probability estimation is
                 used in which the probability estimate is derived
                 solely from the interval renormalizations that are part
                 of the arithmetic coding process. A brief tutorial of
                 arithmetic coding concepts is presented, followed by a
                 discussion of the compatible optimal hardware and
                 software coding structures and the estimation of symbol
                 probabilities from interval renormalization.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B6120B (Codes); B6110 (Information theory); C5230
                 (Digital arithmetic methods); C1260 (Information
                 theory); C4220 (Automata theory)",
  classification = "704; 722; 723; 921; 922; B6110 (Information theory);
                 B6120B (Codes); C1260 (Information theory); C4220
                 (Automata theory); C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Binary Arithmetic Coder; Codes, Symbolic; Coding
                 conventions; coding conventions; Compatible Optimal
                 Hardware; Computer Hardware; Computer Metatheory;
                 Computer Software; digital arithmetic; encoding; finite
                 automata; hardware coding; Hardware coding;
                 information; interval; Interval Renormalization;
                 Interval renormalizations; Mathematical Techniques;
                 Performance; probability; probability estimation;
                 Probability estimation; Probability--Estimation;
                 Q-Coder; Q-coder adaptive binary arithmetic coder;
                 renormalizations; Software coding; Software Coding;
                 software coding; superconducting devices; Symbol
                 Probabilities; Symbol probabilities; symbol
                 probabilities; theory",
  thesaurus =    "Digital arithmetic; Encoding; Finite automata;
                 Information theory; Probability",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Mitchell:1988:OHS,
  author =       "Joan L. Mitchell and William B. Pennebaker",
  title =        "Optimal hardware and software arithmetic coding
                 procedures for the {Q-Coder}",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "727--736",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Q-Coder is an important new development in
                 arithmetic coding. It combines a simple but efficient
                 arithmetic approximation for the multiply operation, a
                 new formalism which yields optimally efficient hardware
                 and software implementations, and a new form of
                 probability estimation. This paper describes the
                 concepts which allow different, yet compatible, optimal
                 software and hardware implementations. In prior binary
                 arithmetic coding algorithms, efficient hardware
                 implementations favored ordering the more probable
                 symbol (MPS) above the less probable symbol (LPS) in
                 the current probability interval. Efficient software
                 implementation required the inverse ordering
                 convention. It is shown that optimal hardware and
                 software encoders and decoders can be achieved with
                 either symbol ordering. Although optimal implementation
                 for a given symbol ordering requires the hardware and
                 software code strings to point to opposite ends of the
                 probability interval, either code string can be
                 converted to match the other exactly. A code string
                 generated using one symbol-ordering convention can be
                 inverted so that it exactly matches the code string
                 generated with the inverse convention. Even where bit
                 stuffing is used to block carry propagation, the code
                 strings can be kept identical.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B6120B (Codes); B6110 (Information theory); C5230
                 (Digital arithmetic methods); C1260 (Information
                 theory); C4220 (Automata theory)",
  classification = "722; 723; 921; 922; B6110 (Information theory);
                 B6120B (Codes); C1260 (Information theory); C4220
                 (Automata theory); C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approximation; arithmetic; Arithmetic approximation;
                 arithmetic coding; Arithmetic coding; Arithmetic
                 Coding; Codes, Symbolic; Coding Algorithms; Computer
                 Hardware; Computer Software; Decoders; decoders;
                 digital arithmetic; encoding; estimation; finite
                 automata; Formalism; formalism; Hardware coding;
                 hardware coding; hardware implementations; Hardware
                 implementations; information; inverse; Inverse ordering
                 convention; Less probable symbol; less probable symbol;
                 Mathematical Techniques; more probable symbol; More
                 probable symbol; Multiply operation; multiply
                 operation; Multiply Operation; ordering convention;
                 Performance; probability; Probability; Probability
                 estimation; Probability Interval; Q-Coder; Q-coder;
                 software implementation; Software implementation;
                 Symbol Ordering; theory",
  thesaurus =    "Digital arithmetic; Encoding; Finite automata;
                 Information theory; Probability",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Pennebaker:1988:PEQ,
  author =       "William B. Pennebaker and Joan L. Mitchell",
  title =        "Probability estimation for the {Q-Coder}",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "737--752",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Q-Coder is an important new development in binary
                 arithmetic coding. It combines a simple but efficient
                 arithmetic approximation for the multiply operation, a
                 new formalism which yields optimally efficient hardware
                 and software implementations, and a new technique for
                 estimating symbol probabilities which matches the
                 performance of any method known. This paper describes
                 the probability-estimation technique. The probability
                 changes are estimated solely from renormalizations in
                 the coding process and require no additional counters.
                 The estimation process can be implemented as a
                 finite-state machine, and is simple enough to allow
                 precise theoretical modeling of single-context coding.
                 Approximate models have been developed for a more
                 complex multi-rate version of the estimator and for
                 mixed-context coding. Experimental studies verifying
                 the modeling and showing the performance achieved for a
                 variety of image-coding models are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B6120B (Codes); B6110 (Information theory); C5230
                 (Digital arithmetic methods); C1260 (Information
                 theory); C4220 (Automata theory)",
  classification = "721; 723; 921; 922; B6110 (Information theory);
                 B6120B (Codes); C1260 (Information theory); C4220
                 (Automata theory); C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Automata Theory; Binary Arithmetic Coding; Binary
                 arithmetic coding; binary arithmetic coding; Codes,
                 Symbolic; context coding; digital arithmetic; encoding;
                 estimation technique; finite automata; finite-state;
                 Finite-state machine; Hardware coding; hardware coding;
                 Image-coding models; image-coding models;
                 implementations; information; machine; mixed-;
                 Mixed-Context Coding; Mixed-context coding; multi-rate
                 version; Multi-rate version; multiply; Multiply
                 operation; operation; Optimally efficient hardware;
                 optimally efficient hardware; Performance; probability;
                 Probability Changes; probability-;
                 Probability--Estimation; Probability-estimation
                 technique; Q-coder; Q-Coder; Renormalizations;
                 renormalizations; Single-context coding; single-context
                 coding; Single-Context Coding; software; Software
                 implementations; Symbol probabilities; symbol
                 probabilities; Symbol Probabilities; theory",
  thesaurus =    "Digital arithmetic; Encoding; Finite automata;
                 Information theory; Probability",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Mitchell:1988:SIQ,
  author =       "Joan L. Mitchell and William B. Pennebaker",
  title =        "Software implementations of the {Q-Coder}",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "753--774",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The Q-Coder is an important new development in
                 arithmetic coding. It combines a simple but efficient
                 arithmetic approximation for the multiply operation, a
                 new formalism which yields optimally efficient hardware
                 and software implementations, and a new technique for
                 estimating symbol probabilities which matches the
                 performance of any method known. This paper describes
                 implementations of the Q-Coder following both the
                 hardware and software paths. Detailed flowcharts are
                 given.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B6120B (Codes); B6110 (Information theory); C5230
                 (Digital arithmetic methods); C1260 (Information
                 theory); C4220 (Automata theory)",
  classification = "722; 723; 921; 922; B6110 (Information theory);
                 B6120B (Codes); C1260 (Information theory); C4220
                 (Automata theory); C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "approximation; arithmetic; Arithmetic approximation;
                 arithmetic coding; Arithmetic coding; Arithmetic
                 Coding; Codes, Symbolic; Computer Hardware; Computer
                 Software; digital arithmetic; efficient hardware;
                 encoding; finite automata; Flowcharts; flowcharts;
                 Formalism; formalism; Hardware coding; hardware coding;
                 information; Mathematical Techniques; multiply
                 operation; Multiply operation; optimally; Optimally
                 efficient hardware; Performance; probabilities;
                 probability; Probability--Estimation; Q-Coder; Q-coder;
                 Software implementations; software implementations;
                 symbol; Symbol probabilities; Symbol Probabilities;
                 theory",
  thesaurus =    "Digital arithmetic; Encoding; Finite automata;
                 Information theory; Probability",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Arps:1988:MVC,
  author =       "Ronald B. Arps and Thomas K. Truong and David J. Lu
                 and Richard C. Pasco and Theodore David Friedman",
  title =        "A multi-purpose {VLSI} chip for adaptive data
                 compression of bilevel images",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "775--795 (or 775--794??)",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A VLSI chip for data compression has been implemented
                 based on a general-purpose adaptive binary arithmetic
                 coding (ABAC) architecture. The architecture permits
                 the reuse of adapter and arithmetic coder logic in a
                 universal way, which together with application
                 -specific model logic can create a variety of powerful
                 compression systems. The specific version of the
                 adapter\slash coder used is the `Q-Coder'. The hardware
                 implementation is in a single HCMOS chip, to maximize
                 speed and minimize cost. The primary purpose of the
                 chip is to provide superior data compression
                 performance for bilevel image data by using conditional
                 binary source models together with adaptive arithmetic
                 coding. The coding scheme implemented is called the
                 Adaptive Bilevel Image Compression (ABIC) algorithm. On
                 business documents, it outperforms such nonadaptive
                 algorithms as the CCITT Group 4 (T.6) Standard and
                 comes into its own when adapting to documents scanned
                 at different resolutions or which include significantly
                 different data such as digital halftones.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center",
  affiliationaddress = "San Jose, CA, USA",
  classcodes =   "B6120B (Codes); B6110 (Information theory); B6140C
                 (Optical information and image processing); C5230
                 (Digital arithmetic methods); C1260 (Information
                 theory); C4220 (Automata theory)C1250 (Pattern
                 recognition)",
  classification = "713; 714; 721; 723; 741; 921; B6110 (Information
                 theory); B6120B (Codes); B6140C (Optical information
                 and image processing); C1250 (Pattern recognition);
                 C1260 (Information theory); C4220 (Automata theory);
                 C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Adapter; adapter; Adaptive arithmetic coding; adaptive
                 arithmetic coding; Adaptive binary arithmetic coding;
                 adaptive binary arithmetic coding; Adaptive Binary
                 Arithmetic Coding (ABAC); Adaptive data compression;
                 Adaptive Data Compression; adaptive data compression;
                 Arithmetic coder logic; arithmetic coder logic;
                 Arithmetic Coder Logic; Bilevel Images; bilevel images;
                 Bilevel images; binary source; Binary source models;
                 Control Systems, Adaptive; Design; digital arithmetic;
                 encoding; finite automata; hardware coding; Hardware
                 coding; HCMOS chip; Image Processing; information;
                 Information Theory--Data Compression; Integrated
                 Circuits, VLSI; models; picture processing;
                 probability; Q-Coder; Q-coder; theory; VLSI; VLSI chip;
                 VLSI Chip",
  thesaurus =    "Digital arithmetic; Encoding; Finite automata;
                 Information theory; Picture processing; Probability;
                 VLSI",
  treatment =    "A Application; P Practical; T Theoretical or
                 Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Thiebaut:1988:FDI,
  author =       "Dominique Thiebaut",
  title =        "From the fractal dimension of the intermiss gaps to
                 the cache-miss ratio",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "796--803",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This work extends a model proposed by Voldman,
                 Mandelbrot, et al. on the fractal nature of the gaps
                 separating cache misses, and shows how the fractal
                 dimension of the gap distribution can be used to
                 predict the miss ratio experienced by the program that
                 has generated the series of cache misses. This result
                 supports the thesis that the fractal dimension of the
                 distribution of the intermiss gaps is a potentially
                 powerful measure for program characterization.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Comput. Sci., Smith Coll.",
  affiliationaddress = "Northampton, MA, USA",
  classcodes =   "C6120 (File organisation)",
  classification = "721; 722; 723; C6120 (File organisation)",
  corpsource =   "Dept. of Comput. Sci., Smith Coll., Northampton, MA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "buffer storage; Cache-miss ratio; Cache-Miss Ratio;
                 cache-miss ratio; Computer Metatheory; Computer
                 Software; Data Storage, Digital; Fractal dimension;
                 fractal dimension; Fractal Dimension; fractals; Gap
                 Distribution; Gap distribution; gap distribution;
                 intermiss gaps; Intermiss gaps; Intermiss Gaps; Memory
                 access pattern; memory access pattern; Memory Caches;
                 Program characterization; Program Characterization;
                 program characterization; storage management",
  thesaurus =    "Buffer storage; Fractals; Storage management",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ghez:1988:KFS,
  author =       "Richard Ghez and Subramanian S. Iyer",
  title =        "The kinetics of fast steps on crystal surfaces and its
                 application to the molecular beam epitaxy of silicon",
  journal =      j-IBM-JRD,
  volume =       "32",
  number =       "6",
  pages =        "804--818",
  month =        nov,
  year =         "1988",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Crystal growth by molecular beam epitaxy (MBE) occurs
                 under conditions of high supersaturation. The classic
                 growth theory of Burton, Cabrera, and Frank is based on
                 the assumption that surface steps move slowly.
                 Consequently, it requires modifications to be
                 applicable to MBE because the velocities of surface
                 steps may be large. Because such steps are asymmetric
                 structures, as observed experimentally by field ion
                 microscopy, capture probabilities from above and from
                 below a step must differ markedly. Hence the adatom
                 concentration distribution cannot be at equilibrium at
                 steps; there, it also suffers a discontinuity. We
                 propose a model that treats surface step motion as a
                 Stefan problem and that also respects its physical
                 asymmetry. Calculations are presented which extend and
                 complete recently published results that had imposed
                 the restrictive condition of local equilibrium at
                 steps. Step velocity is estimated as a function of
                 supersaturation, degree of asymmetry, and step density.
                 Concentration profiles are then computed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  chemicalindex = "Si/int Si/el",
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A8115G (Vacuum deposition); A6820 (Solid surface
                 structure); B0510D (Epitaxial growth); B2520C
                 (Elemental semiconductors)",
  classification = "549; 712; 933; A6820 (Solid surface structure);
                 A6855 (Thin film growth, structure, and epitaxy);
                 A8115G (Vacuum deposition); B0510D (Epitaxial growth);
                 B2520C (Elemental semiconductors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Adatom Concentration Distribution; Adatom
                 concentration distribution; adatom concentration
                 distribution; capture; Capture probabilities; Capture
                 Probabilities; Crystal surfaces; crystal surfaces;
                 Crystals--Epitaxial Growth; elemental semiconductors;
                 epitaxy; Fast steps; fast steps; Field ion microscopy;
                 field ion microscopy; Growth; Kinetics; kinetics; Local
                 Equilibrium; MBE; molecular beam; molecular beam
                 epitaxial growth; Molecular beam epitaxy; Molecular
                 Beam Epitaxy; probabilities; problem; Semiconducting
                 Silicon; semiconductor epitaxial layers; semiconductor
                 growth; Si; silicon; Stefan; Stefan problem; Stefan
                 Problem; Step Velocity; Supersaturation;
                 supersaturation; Surface Steps; surface structure",
  thesaurus =    "Elemental semiconductors; Molecular beam epitaxial
                 growth; Semiconductor epitaxial layers; Semiconductor
                 growth; Silicon; Surface structure",
  treatment =    "B Bibliography; T Theoretical or Mathematical",
}

@Article{Benson:1989:DSB,
  author =       "Richard C. Benson and Chisin Chiang and Frank E.
                 Talke",
  title =        "The dynamics of slider bearings during contacts
                 between slider and disk",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "1",
  pages =        "2--14",
  month =        jan,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The dynamics of a `mini-Winchester' magnetic recording
                 slider are studied during contacts with a hard,
                 rotating memory disk using numerical simulation. An
                 on-line solution of the Reynolds equation is used to
                 calculate the air-film pressure and a
                 `coefficient-of-restitution' model is used to describe
                 intermittent slider\slash disk contacts. Studies are
                 made to identify system configurations which reduce the
                 possibility of a `head crash' during contact
                 start\slash stop.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Mech. Eng., Rochester Univ.",
  affiliationaddress = "Rochester, NY, USA",
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media)",
  classification = "421; 601; 721; 722; B3120B (Magnetic recording);
                 C5320C (Storage on moving magnetic media)",
  corpsource =   "Dept. of Mech. Eng., Rochester Univ., NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Air-Film Pressure; Bearings--Mechanical Properties;
                 configurations; Contact start/stop; contact start/stop;
                 Data Storage, Magnetic; Disk; Dynamics; dynamics;
                 equation; hard discs; Hard disk; hard disk;
                 Intermittent slider/disk contacts; intermittent
                 slider/disk contacts; Magnetic Recording; magnetic
                 recording; Magnetic recording slider; Memory Disk;
                 On-line solution; on-line solution; Reynolds; Reynolds
                 Equation; Reynolds equation; Rotating memory disk;
                 rotating memory disk; slider; Slider bearings; Slider
                 Bearings; slider bearings; Slider/Disk Contacts;
                 system; System configurations",
  thesaurus =    "Hard discs",
  treatment =    "P Practical",
}

@Article{Matick:1989:FCC,
  author =       "Richard E. Matick",
  title =        "Functional cache chip for improved system
                 performance",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "1",
  pages =        "15--32",
  month =        jan,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of a cache to improve the performance of
                 computing systems is becoming pervasive, from
                 microprocessors to high-end systems. The general
                 approach has traditionally been to use ordinary fast
                 RAM chips and interface these close to the processor
                 for speed. However, this is far from the ideal
                 solution. The stringent and often conflicting
                 requirements on the cache bandwidth for servicing the
                 processor and minimizing reload time can severely limit
                 attainable performance. The cache need not be the
                 performance-limiting factor if a properly integrated
                 functional cache chip is used. This paper defines the
                 requirements of a cache subsystem and shows how these
                 have been or could be implemented in typical systems.
                 The functional requirements of an optimal cache chip
                 design are presented and illustrated.",
  acknowledgement = ack-nhfb,
  affiliation =  "Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B1265D (Memory circuits); C5320G (Semiconductor
                 storage)",
  classification = "714; 721; 722; B1265D (Memory circuits); C5320G
                 (Semiconductor storage)",
  corpsource =   "Thomas J. Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "buffer storage; Cache bandwidth; Cache Bandwidth;
                 cache bandwidth; Cache Subsystem; Chip design; chip
                 design; Computing systems; computing systems; Data
                 Storage, Digital; Functional Cache Chip; integrated
                 functional cache chip; Integrated functional cache
                 chip; integrated memory circuits; Logic Devices; Memory
                 Chips; ram Chips; Random Access; Reload time; reload
                 time; system performance; System performance",
  thesaurus =    "Buffer storage; Integrated memory circuits",
  treatment =    "A Application; P Practical",
}

@Article{Paul:1989:MEI,
  author =       "Clayton R. Paul",
  title =        "Modeling electromagnetic interference properties of
                 printed circuit boards",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "1",
  pages =        "33--50",
  month =        jan,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The mathematical modeling of a printed circuit board
                 (PCB) for the prediction of its electromagnetic
                 interference (EMI) properties is investigated. Two key
                 aspects examined are crosstalk and the high-frequency
                 voltage developed between the ends of a PCB land
                 (ground drop). The notion of partial inductance as
                 opposed to loop inductance is the key to predicting the
                 high-frequency voltage that are developed between two
                 ends of a land. Crosstalk predictions are a by-product
                 of the modeling. Experimental results illustrate the
                 accuracy of the model. A technique for the accurate
                 measurement of the high-frequency voltage developed
                 between two ends of a PCB land is described and
                 explained in terms of partial inductances.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. Eng., Kentucky Univ.",
  affiliationaddress = "Lexington, KY, USA",
  classcodes =   "B2210B (Printed circuit layout and design); B5230
                 (Electromagnetic compatibility and interference)",
  classification = "701; 703; 711; 713; 714; B2210B (Printed circuit
                 layout and design); B5230 (Electromagnetic
                 compatibility and interference)",
  corpsource =   "Dept. of Electr. Eng., Kentucky Univ., Lexington, KY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "boards; Crosstalk; crosstalk; Crosstalk Predictions;
                 Electromagnetic Compatibility; Electromagnetic
                 Interference; electromagnetic interference;
                 Electromagnetic interference properties;
                 electromagnetic interference properties; EMI; frequency
                 voltage; Ground drop; ground drop; high-;
                 High-frequency voltage; High-Frequency Voltage;
                 high-frequency voltage; inductance; loop inductance;
                 Loop inductance; Mathematical modeling; mathematical
                 modeling; Mathematical Models; partial; Partial
                 inductance; Partial Inductance; PCB land; printed
                 circuit; Printed Circuit Boards; Printed circuit
                 boards; printed circuit design; Printed Circuits;
                 Signal Interference--Crosstalk",
  thesaurus =    "Electromagnetic interference; Printed circuit design",
  treatment =    "X Experimental",
}

@Article{Tetzlaff:1989:ABS,
  author =       "William H. Tetzlaff and Martin G. Kienzle and Juan A.
                 Garay",
  title =        "Analysis of block-paging strategies",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "1",
  pages =        "51--59",
  month =        jan,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The performance of interactive paging systems in
                 general and Virtual Machine/System Product (VM/SP)
                 systems with the High Performance Option (HPO) in
                 particular depends upon locality of reference. This
                 storage-management dependency, often considered in the
                 context of individual programs, extends in fact to a
                 significant degree across most virtual-machine
                 transactions. This paper investigates strategies to
                 exploit locality of reference at the system level by
                 analyzing page-reference strings gathered from live
                 systems. Alternative strategies are evaluated using
                 trace-driven simulations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "C6120 (File organisation)",
  classification = "721; 722; 723; C6120 (File organisation)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Block-Paging Strategies; Block-paging strategies;
                 block-paging strategies; Computer Programming; Data
                 Processing; Data Storage, Digital; High Performance
                 Option; Interactive Paging; interactive paging systems;
                 Interactive paging systems; Live systems; live systems;
                 Machine/System Product; management dependency; page-;
                 Page-Reference Strings; Page-reference strings;
                 reference strings; storage management; storage-;
                 Storage-Management Dependency; Storage-management
                 dependency; Trace-Driven Simulations; Trace-driven
                 simulations; trace-driven simulations; Virtual; Virtual
                 Machine/System Product; virtual storage;
                 Virtual-machine transactions; virtual-machine
                 transactions; Virtual-Machine Transactions",
  thesaurus =    "Storage management; Virtual storage",
  treatment =    "P Practical",
}

@Article{Howell:1989:SPS,
  author =       "Thomas D. Howell",
  title =        "Statistical properties of selected recording codes",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "1",
  pages =        "60--73 (or 15--32??)",
  month =        jan,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94B60",
  MRnumber =     "89k:94080",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Most recording systems encode their data using binary
                 run-length-limited (RLL) codes. Statistics such as the
                 density of 1s, the probabilities of specific code
                 strings or run lengths, and the power spectrum are
                 useful in analyzing the performance of RLL codes in
                 these applications. These statistics are easy to
                 compute for ideal run-length-limited codes, those whose
                 only constraints are the run-length limits, but ideal
                 RLL codes are not usable in practice because their code
                 rates are irrational. Implemented RLL codes achieve
                 rational rates by not using all code sequences which
                 satisfy the run-length constraints, and their
                 statistics are different from those of the ideal RLL
                 codes. Little attention has been paid to the
                 computation of statistics for these practical codes. A
                 method is presented for computing statistics of
                 implemented codes. The key step is to develop an exact
                 description of the code sequences which are used. A
                 consequence of the code having rational rate is that
                 all the code-string and run-length probabilities are
                 rational. The method is illustrated by applying it to
                 three codes of practical importance: MFM, (2, 7), and
                 (1, 7).",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center",
  affiliationaddress = "San Jose, CA, USA",
  classcodes =   "C5320C (Storage on moving magnetic media); C5320K
                 (Optical storage)",
  classification = "714; 721; 722; 723; 922; C5320C (Storage on moving
                 magnetic media); C5320K (Optical storage)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(1,7) Codes; (1,7) codes; (2,7) codes; (2,7) Codes;
                 Analysis; binary; Binary run-length-limited; Binary
                 Run-Length-Limited (RLL) Codes; Cache Bandwidth; Cache
                 Subsystem; code; Code rates; Code sequences; Code
                 Sequences; code sequences; code strings; Code Strings;
                 Code strings; codes; Codes, Symbolic; Data Storage,
                 Digital; Functional Cache Chip; Logic Devices; magnetic
                 recording; Memory Chips; MFM; optical storage; power
                 spectrum; Power spectrum; probabilities; ram Chips;
                 Random Access; rates; Rational rate; rational rate;
                 Rational Rates; Recording Codes; run-length; Run-Length
                 Probabilities; Run-length probabilities;
                 run-length-limited; selected recording codes; Selected
                 recording codes; Statistical Methods; Statistics;
                 statistics",
  reviewer =     "L. L. Campbell",
  thesaurus =    "Codes; Magnetic recording; Optical storage",
  treatment =    "P Practical; T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Jayaraman:1989:GTV,
  author =       "Rangarajan Jayaraman and Vijay Srinivasan",
  title =        "Geometric tolerancing. {I}. {Virtual} boundary
                 requirements",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "90--104",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68U05",
  MRnumber =     "993 626",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "679.68201",
  abstract =     "We examine the representation of geometric tolerances
                 in solid-geometric models from the perspective of two
                 classes of functional requirements. The first class
                 deals with positioning of parts with respect to one
                 another in an assembly, and the second with maintaining
                 material bulk in critical portions of parts. Both are
                 directly relatable to the geometry of the parts.
                 Through examples, we demonstrate that these functional
                 requirements can be captured in a specific form of
                 tolerances designated as virtual boundary requirements
                 (VBRs). We further demonstrate that the only proposed
                 theory of tolerances in solid models, and the current
                 dimensioning and tolerancing standards in industrial
                 practice, are both inadequate for dealing with VBRs.
                 Accordingly, we develop a theoretical basis for the
                 rigorous statement and interpretation of VBRs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B0170C (Project and design engineering)",
  classification = "601; 921; B0170C (Project and design engineering)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Assembly; Assembly Functional Requirements;
                 boundary-value problems; design engineering;
                 functional; Functional requirements; geometric
                 tolerances; Geometric tolerances; Geometric
                 Tolerancing; Material bulk; material bulk; Material
                 Bulk Requirements; Mathematical Techniques--Geometry;
                 Mechanical Product Design; modelling; positioning;
                 Positioning; Product Design; requirements; Solid
                 Geometric Models; solid-geometric models;
                 Solid-geometric models; theory; tolerances; Tolerances,
                 design; virtual boundary; Virtual Boundary
                 Requirements; Virtual boundary requirements",
  subject =      "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
                 \\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations \\ F.2.2
                 Theory of Computation, ANALYSIS OF ALGORITHMS AND
                 PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Geometrical problems and computations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous",
  thesaurus =    "Boundary-value problems; Design engineering;
                 Modelling",
  treatment =    "P Practical",
}

@Article{Srinivasan:1989:GTI,
  author =       "Vijay Srinivasan and Rangarajan Jayaraman",
  title =        "Geometric tolerancing. {II}. {Conditional}
                 tolerances",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "105--124",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68U05",
  MRnumber =     "993 627",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In a companion paper we examined the representation of
                 geometric tolerances in solid models from the
                 perspective of certain functional requirements. We
                 showed that assembly and material bulk requirements can
                 be specified as virtual boundary requirements (VBRs).
                 Here, we study the related issue of deriving equivalent
                 alternative specifications. Specifically, we first
                 explore the reasons for converting VBRs to another form
                 of tolerances designated as conditional tolerances
                 (CTs). We then develop a theoretical basis for
                 converting VBRs to CTs and derive CTs for some common
                 and practical VBRs. We thereby demonstrate the
                 difficulties in finding a general-purpose algorithm for
                 such conversions and also show that some of the CT
                 formulas used in current practice are incorrect.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B0170C (Project and design engineering)",
  classification = "601; 921; 922; B0170C (Project and design
                 engineering)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Assembly; boundary-value problems; Conditional
                 tolerances; Conditional Tolerances; conditional
                 tolerances; design; design engineering; General Purpose
                 Algorithm; General-purpose algorithm; general-purpose
                 algorithm; Geometric Tolerancing; Mathematical Models;
                 Mathematical Statistics; Mathematical
                 Techniques--Algorithms; modelling; Position
                 Tolerancing; Product Design; Statistical Tolerancing;
                 theory; VBRs; verification; Virtual Boundary
                 Requirements",
  subject =      "J.6 Computer Applications, COMPUTER-AIDED ENGINEERING
                 \\ I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations \\ F.2.2
                 Theory of Computation, ANALYSIS OF ALGORITHMS AND
                 PROBLEM COMPLEXITY, Nonnumerical Algorithms and
                 Problems, Geometrical problems and computations \\
                 G.2.m Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous",
  thesaurus =    "Boundary-value problems; Design engineering;
                 Modelling",
  treatment =    "P Practical",
}

@Article{RadicatidiBrozolo:1989:CGS,
  author =       "Giuseppe {Radicati di Brozolo} and Marcello
                 Vitaletti",
  title =        "Conjugate-gradient subroutines for the {IBM 3090}
                 {Vector Facility}",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "125--135",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper describes a set of optimized subroutines
                 for use in solving sparse, symmetric, positive definite
                 linear systems of equations using iterative algorithms.
                 The set has been included in the Engineering and
                 Scientific Subroutine Library (ESSL) for the IBM 3090
                 Vector Facility (VF). The subroutines are based on the
                 conjugate-gradient method, preconditioned by the
                 diagonal or by an incomplete factorization. They make
                 use of storage representations of sparse matrices that
                 are optimal for vector implementation. The ESSL vector
                 subroutines are up to six times faster than a scalar
                 implementation of the same algorithm.",
  acknowledgement = ack-nhfb,
  affiliation =  "Eur. Center for Sci. and Eng. Comput., IBM Italy,
                 Rome, Italy",
  classcodes =   "C4140 (Linear algebra); C7310 (Mathematics)",
  classification = "723; 921; C4140 (Linear algebra); C7310
                 (Mathematics)",
  corpsource =   "Eur. Center for Sci. and Eng. Comput., IBM Italy,
                 Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Codes, Symbolic; Computer Programming;
                 Computer Programming languages--fortran;
                 Conjugate-gradient method; conjugate-gradient method;
                 Conjugate-Gradient Subroutines; definite linear
                 systems; design; Engineering and Scientific Subroutine
                 Library (ESSL); ESSL; fortran Codes; IBM 3090 Vector
                 Facility; IBM 3090 Vector Facility (VF); Incomplete
                 factorization; incomplete factorization; Iterative
                 algorithms; Iterative Algorithms; iterative algorithms;
                 iterative methods; Mathematical Techniques--Iterative
                 Methods; matrix algebra; measurement; Optimized
                 subroutines; optimized subroutines; parallel
                 algorithms; performance, IBM 3090 Vector Facility;
                 positive; Positive definite linear systems;
                 representations; Sparse matrices; sparse matrices;
                 storage; Storage representations; Subroutines;
                 subroutines; Vector implementation; vector
                 implementation",
  subject =      "G.1.3 Mathematics of Computing, NUMERICAL ANALYSIS,
                 Numerical Linear Algebra, Linear systems (direct and
                 iterative methods) \\ G.4 Mathematics of Computing,
                 MATHEMATICAL SOFTWARE \\ G.1.6 Mathematics of
                 Computing, NUMERICAL ANALYSIS, Optimization, Gradient
                 methods",
  thesaurus =    "Iterative methods; Matrix algebra; Parallel
                 algorithms; Subroutines",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Succi:1989:LHI,
  author =       "Sauro Succi and Dominique d'Humieres and Ferenc
                 Szelenyi",
  title =        "Lattice-gas hydrodynamics on the {IBM 3090} vector
                 facility",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "136--148",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "After a brief review of the means for characterizing
                 lattice gases using cellular automata rules, the
                 authors discuss the implementation of the rules for
                 simulating hydrodynamic phenomena which can be
                 described by the Navier--Stokes equations. Special
                 emphasis is placed on data-mapping strategies and
                 implementation through the use of the high speed and
                 large memory resources offered by vector
                 multiprocessors such as the IBM 3090 Vector Facility.
                 Performance data pertain to square and hexagonal
                 lattice gases. The limits of the approach used and its
                 potential extendability to other areas are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Eur. Center for Sci. and Eng. Comput., IBM Italy",
  affiliationaddress = "Rome, Italy",
  classcodes =   "A4710 (General theory, simulation and other
                 computational methods); A0550 (Lattice theory and
                 statistics; Ising problems); C7320 (Physics and
                 Chemistry)",
  classification = "631; 722; 723; 921; 931; A0550 (Lattice theory and
                 statistics; A4710 (General theory, simulation and other
                 computational methods); C7320 (Physics and Chemistry);
                 Ising problems)",
  corpsource =   "Eur. Center for Sci. and Eng. Comput., IBM Italy,
                 Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "cellular automata; Cellular automata rules; Cellular
                 Automata Rules; Computer Aided Analysis; Computer
                 Systems, Digital--Multiprocessing; Data Mapping
                 Strategies; Data Processing; data-; Data-mapping
                 strategies; design; finite automata; Gases;
                 hydrodynamic phenomena; Hydrodynamic phenomena;
                 hydrodynamics; Hydrodynamics; IBM 3090 Vector Facility;
                 lattice gases; Lattice gases; lattice theory and;
                 Lattice-Gas Hydrodynamics; mapping strategies;
                 measurement; Memory resources; memory resources; Navier
                 Stokes Equations; Navier--Stokes equations;
                 performance, IBM 3090 Vector Facility; physics
                 computing; rules; statistics; Vector Multiprocessor;
                 Vector multiprocessors; vector multiprocessors",
  subject =      "F.1.1 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Models of Computation, Unbounded-action
                 devices \\ G.2.m Mathematics of Computing, DISCRETE
                 MATHEMATICS, Miscellaneous \\ G.1.m Mathematics of
                 Computing, NUMERICAL ANALYSIS, Miscellaneous \\ J.2
                 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Physics",
  thesaurus =    "Finite automata; Hydrodynamics; Lattice theory and
                 statistics; Navier--Stokes equations; Physics
                 computing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Waicukauski:1989:MGW,
  author =       "John A. Waicukauski and Eric Lindbloom and Edward B.
                 Eichelberger and Orazio P. Forlenza",
  title =        "A method for generating weighted random test
                 patterns",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "149--161",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A new method for generating weighted random patterns
                 for testing LSSD logic chips and modules is described.
                 Advantages in using weighted random versus either
                 deterministic or random test patterns are discussed. An
                 algorithm for calculating an initial set of
                 input-weighting factors and a procedure for obtaining
                 complete stuck-fault coverage are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Gen. Technol., IBM Corp.",
  affiliationaddress = "Hopewell Junction, NY, USA",
  classcodes =   "B1265B (Logic circuits); C5210 (Logic design methods);
                 C5120 (Logic and switching circuits)",
  classification = "713; 714; 721; 723; 922; B1265B (Logic circuits);
                 C5120 (Logic and switching circuits); C5210 (Logic
                 design methods)",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Hopewell Junction,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Computer Programming--Algorithms; design; Initial
                 Weight Generation; Input Weighting Factors;
                 Input-weighting factors; input-weighting factors;
                 Integrated Circuit Testing; Integrated Circuits,
                 VLSI-testing; integrated logic circuits; Logic Devices;
                 logic testing; LSSD Logic Chips; LSSD logic chips;
                 measurement; modules; Modules; performance;
                 reliability; Stuck Fault Coverage; Stuck-fault
                 coverage; stuck-fault coverage; Testing; verification,
                 Weighted random test patterns; Weighted Random Test
                 Patterns; weighted random test patterns",
  subject =      "B.7.3 Hardware, INTEGRATED CIRCUITS, Reliability and
                 Testing, Test generation \\ B.7.1 Hardware, INTEGRATED
                 CIRCUITS, Types and Design Styles, Advanced
                 technologies \\ C.4 Computer Systems Organization,
                 PERFORMANCE OF SYSTEMS",
  thesaurus =    "Integrated logic circuits; Logic testing",
  treatment =    "P Practical",
}

@Article{Stapper:1989:LFC,
  author =       "Charles H. Stapper",
  title =        "Large-area fault clusters and fault tolerance in
                 {VLSI} circuits: a review",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "162--173",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Fault-tolerance techniques and redundant circuits have
                 been used extensively to increase the manufacturing
                 yield and productivity of integrated-circuit chips.
                 Presented here is a review of relevant statistical
                 models which have been used to account for the effects
                 on manufacturing yield of the large-area defect and
                 fault clusters commonly encountered during chip
                 fabrication. A statistical criterion is described for
                 determining whether such large-area clusters are
                 present.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Gen. Technol., IBM Corp.",
  affiliationaddress = "Essex Junction, VT, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits)",
  classification = "713; 714; 921; 922; B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Chip fabrication; chip fabrication; Cluster Parameter
                 Dependencies; experimentation; fault clusters; Fault
                 clusters; fault location; fault tolerance; Fault
                 Tolerance; Fault tolerance; integrated circuit testing;
                 Integrated Circuits, VLSI; Integrated-circuit chips;
                 integrated-circuit chips; Large-Area Fault Clusters;
                 manufacturing yield; Manufacturing yield; Mathematical
                 Models; Mathematical Statistics--Applications;
                 measurement; performance; productivity; Productivity;
                 Redundancy; redundancy; redundant circuits; Redundant
                 circuits; reliability; statistical criterion;
                 Statistical criterion, design; Statistical models;
                 Statistical Models; statistical models; verification;
                 VLSI; VLSI circuits",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ B.7.3
                 Hardware, INTEGRATED CIRCUITS, Reliability and Testing
                 \\ C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS",
  thesaurus =    "Fault location; Integrated circuit testing;
                 Redundancy; VLSI",
  treatment =    "P Practical",
}

@Article{Stapper:1989:SFC,
  author =       "Charles H. Stapper",
  title =        "Small-area fault clusters and fault tolerance in
                 {VLSI} circuits",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "174--177",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In previous treatments of the manufacturing yield of
                 fault-tolerant integrated-circuit chips, fault clusters
                 were either assumed to be absent or relatively large in
                 area. Presented here is a treatment in which the
                 occurrence of small-area fault clusters is assumed.
                 Four different types of statistical distributions are
                 considered, and a criterion is described for
                 determining whether small-area fault clusters are
                 present.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Gen. Technol., IBM Corp.",
  affiliationaddress = "Essex Junction, VT, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits)",
  classification = "713; 714; 921; 922; B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "Div. of Gen. Technol., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "area fault clusters; design; experimentation; fault
                 clusters; Fault clusters; fault location; Fault
                 Tolerance; fault tolerance; fault-; Fault-tolerant
                 integrated-circuit chips; integrated circuit testing;
                 Integrated Circuits, VLSI; manufacturing yield;
                 Manufacturing yield; Mathematical Models; Mathematical
                 Statistics; measurement; Negative Binomial Model;
                 performance; reliability; small-; Small-Area Fault
                 Clusters; Small-area fault clusters; Statistical
                 distributions; statistical distributions; Statistical
                 Models; tolerant integrated-circuit chips;
                 verification, Fault tolerance; VLSI; VLSI circuits",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, VLSI (very large scale integration) \\ B.7.3
                 Hardware, INTEGRATED CIRCUITS, Reliability and Testing
                 \\ C.4 Computer Systems Organization, PERFORMANCE OF
                 SYSTEMS \\ G.3 Mathematics of Computing, PROBABILITY
                 AND STATISTICS, Statistical computing",
  thesaurus =    "Fault location; Integrated circuit testing; VLSI",
  treatment =    "P Practical",
}

@Article{Molteni:1989:TOS,
  author =       "William J. {Molteni, Jr.} and David Small",
  title =        "Translating object specifications into a
                 computer-generated three-dimensional graphic to be
                 reproduced as a high efficiency, reflection
                 photo-polymer hologram suitable for mass-production",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "2",
  pages =        "178--181",
  month =        mar,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A process is described for translating the
                 specifications of an object and its interrelationship
                 with another object into a three-dimensional computer
                 graphic and then into a photo-polymer hologram. The
                 capability to translate specifications about objects
                 and their interrelationships into accurate holograms
                 without having to create either a physical model or the
                 manufactured object itself opens exciting possibilities
                 in the areas of creative design and communication. It
                 may assist in the manufacturing process by allowing
                 designers to specify objects and to study accurate,
                 three-dimensional representations of those
                 specifications, including interrelationships with other
                 objects, without the need for an actual physical model.
                 Finally, the hologram may become a means for effective
                 representation of an image produced through the use of
                 three-dimensional computer graphics for people without
                 access to appropriate computer graphics.",
  abstract-2 =   "The capability to translate specifications about
                 objects and their interrelationships into accurate
                 holograms without having to create either a physical
                 model or the manufactured object itself opens exciting
                 possibilities in the areas of creative design and
                 communication. It may assist in the manufacturing
                 process by allowing designers to specify objects and to
                 study accurate, three-dimensional representations of
                 those specifications, including interrelationships with
                 other objects, without the need for an actual physical
                 model. Finally, the hologram may become a means for
                 effective representation of an image produced through
                 the use of three-dimensional computer graphics for
                 people without access to appropriate computer graphics.
                 The process described here was divided into two
                 segments. The MIT Media Lab was responsible for
                 creating a sequence of computer-generated images and
                 transferring those images to film. Polaroid Corporation
                 was responsible for creating the hologram from the
                 images on film.",
  acknowledgement = ack-nhfb,
  affiliation =  "Polaroid Corp.",
  affiliationaddress = "Cambridge, MA, USA",
  classcodes =   "B4350 (Holography); C5260B (Computer vision and
                 picture processing)",
  classification = "723; 743; B4350 (Holography); C5260B (Computer
                 vision and picture processing)",
  corpsource =   "Polaroid Corp., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accurate; Accurate holograms; computer graphics;
                 Computer Graphics; computer-generated holography;
                 Computer-generated images; computer-generated images;
                 computer-generated three-dimensional;
                 Computer-generated three-dimensional graphic; Creative
                 Design; creative design; Creative design; design,
                 Object specifications; graphic; Holograms; holograms;
                 MIT Media Lab; object specifications; Object
                 Specifications; Photo-Polymer Hologram; physical model;
                 Physical model; Polaroid Corporation; reflection
                 photo-polymer hologram; Reflection photo-polymer
                 hologram; Three Dimensional Graphics",
  subject =      "I.3.7 Computing Methodologies, COMPUTER GRAPHICS,
                 Three-Dimensional Graphics and Realism \\ J.6 Computer
                 Applications, COMPUTER-AIDED ENGINEERING",
  thesaurus =    "Computer graphics; Computer-generated holography",
  treatment =    "A Application; P Practical",
}

@Article{Kitazawa:1989:CUE,
  author =       "Koichi Kitazawa",
  title =        "Current understanding of electronic structure and some
                 difficulties with cuprate semiconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "201--207",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Experimental observations of the high-T$_c$ cuprate
                 superconductors are reviewed from the perspective of
                 electronic structures. On the basis of
                 Mott-Hubbard-type band splitting, the semiconductivity,
                 antiferromagnetism, and metallic nature of the cuprate
                 oxides are discussed as a function of the dopant
                 concentration. Then the involvement of the O 2p band
                 which falls between the lower and upper Hubbard bands,
                 as determined by electron spectroscopy, is discussed.
                 The complex nature of the Fermi surface is considered,
                 and the importance of the involvement of both the O 2p
                 and the lower Hubbard band is stressed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Ind. Chem.",
  affiliationaddress = "Tokyo, Jpn",
  chemicalindex = "Cu/ss O/ss",
  classcodes =   "A7125T (Band structure of crystalline semiconductor
                 compounds and insulators); A7470V (Perovskite phase
                 superconductors); A7125H (Measurement of Fermi surface
                 parameters); A7550E (Antiferromagnetics)",
  classification = "701; 712; 804; 933; A7125H (Measurement of Fermi
                 surface parameters); A7125T (Band structure of
                 crystalline semiconductor compounds and insulators);
                 A7470V (Perovskite phase superconductors); A7550E
                 (Antiferromagnetics)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Dept. of Ind. Chem., Tokyo Univ., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "antiferromagnetic properties of substances;
                 Antiferromagnetism; antiferromagnetism; Band Splitting;
                 band structure; Copper Oxide--Doping; cuprate; Cuprate
                 Oxides; Cuprate oxides; cuprate semiconductors; Cuprate
                 Semiconductors; Cuprate semiconductors; Cuprate
                 superconductors; cuprate superconductors; design, High
                 temperature superconductors; Dopant Concentration;
                 Dopant concentration; dopant concentration; electron;
                 Electron spectroscopy; Electronic Properties;
                 Electronic structures; electronic structures;
                 experimentation; Fermi surface; Fermi Surface; Fermi
                 surface; high temperature superconductors;
                 high-temperature superconductors; Hubbard bands;
                 Hubbard Bands; Hubbard model; measurement; metallic;
                 Metallic; Mott-Hubbard-; Mott-Hubbard-type band
                 splitting; of crystalline semiconductors and
                 insulators; oxides; performance; Semiconductor
                 Materials; spectroscopy; superconducting
                 semiconductors; type band splitting",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Antiferromagnetic properties of substances; Band
                 structure of crystalline semiconductors and insulators;
                 Fermi surface; High-temperature superconductors;
                 Hubbard model; Superconducting semiconductors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Batlogg:1989:HSB,
  author =       "Bertram Batlogg and Robert J. Cava and Lynn F.
                 Schneemeyer and Gerald P. Espinosa",
  title =        "High-{T}$_c$ superconductivity in bismuthates --- How
                 many roads lead to high {T}$_c$?",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "208--214",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The superconducting transition temperature in
                 BaBiO$_3$-based superconductors exceeds 30 K. Magnetic
                 measurements are analyzed to give their density of
                 states at E$_F$, N*(0) varies as gamma. The uniqueness
                 of Bi-O and Cu-O superconductors is revealed in an
                 updated T$_c$- gamma plot. The two classes of compounds
                 share basic electronic properties, particularly a
                 partially unoccupied band with significant O 2p
                 character, which might favor a common pairing
                 mechanism.",
  acknowledgement = ack-nhfb,
  affiliation =  "AT and T Bell Labs.",
  affiliationaddress = "Murray Hill, NJ, USA",
  chemicalindex = "BaBiO3/ss Ba/ss Bi/ss O3/ss O/ss",
  classcodes =   "A7410 (Occurrence, critical temperature); A7470V
                 (Perovskite phase superconductors); A7430C
                 (Magnetization curves, Meissner effect, penetration
                 depth)",
  classification = "701; 708; 804; A7410 (Occurrence, critical
                 temperature); A7430C (Magnetization curves, Meissner
                 effect, penetration depth); A7470V (Perovskite phase
                 superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "AT and T Bell Labs., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "BaBiO$_3$; BaBiO/sub 3/; barium compounds; Bismuth
                 Compounds--Electric Conductivity; bismuthates;
                 Bismuthates; density; Density of states; design;
                 electronic density of states; electronic properties;
                 Electronic properties; high temperature
                 superconductors; High Temperature Superconductors; High
                 temperature superconductors; high-; magnetic
                 measurements; Magnetic measurements; magnetisation;
                 measurement; of states; pairing; Pairing; Pairing
                 Mechanism; performance; Physical Properties;
                 superconducting; Superconducting Materials;
                 superconducting transition temperature; Superconducting
                 Transition Temperature; Superconducting transition
                 temperature; Superconductivity; temperature
                 superconductors; transition temperature",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; Electronic density of states;
                 High-temperature superconductors; Magnetisation;
                 Superconducting transition temperature",
  treatment =    "X Experimental",
}

@Article{Varma:1989:IRC,
  author =       "Chaudhra M. Varma",
  title =        "Interim report on the charge-transfer resonance model
                 for the {Cu-O} superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "215--219",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The two-band model including intra-atomic repulsion on
                 Cu and near-neighbor Cu-O repulsion for the high
                 temperature superconductors is supported by experiments
                 and theoretical calculations as the minimum necessary.
                 The specific mechanism for high T$_c$ through
                 charge-transfer resonances was proposed because the
                 known alternative mechanisms --- phonons and magnetic
                 excitations --- were believed unlikely. The case for
                 charge-transfer-resonance-induced high T$_c$ has,
                 however, not yet been proven. The various anomalies in
                 the metallic state are not yet understood. However,
                 calculations on the model do show a charge-transfer-gap
                 insulating state which is antiferromagnetic at and near
                 \$HLF filling, a metallic state for intermediate
                 filling with effective particle-particle attraction,
                 and a charge-transfer instability beyond a certain
                 filling.",
  acknowledgement = ack-nhfb,
  affiliation =  "AT and T Bell Labs.",
  affiliationaddress = "Murray Hill, NJ, USA",
  chemicalindex = "Cu/ss O/ss",
  classcodes =   "A7420 (Theory); A7470V (Perovskite phase
                 superconductors)",
  classification = "701; 708; 804; 933; A7420 (Theory); A7470V
                 (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "AT and T Bell Labs., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Antiferromagnetic; antiferromagnetic; band model;
                 Charge-Transfer Resonance; charge-transfer resonance
                 model; Copper Compounds--Electric Conductivity; Cu-O
                 superconductors; design, Charge-transfer resonance
                 model; experimentation; High Temperature
                 Superconductors; high-temperature; high-temperature
                 superconductors; High-temperature superconductors;
                 Instability; instability; Insulating state; insulating
                 state; Intra-atomic repulsion; intra-atomic repulsion;
                 Intra-Atomic Repulsion; Mathematical Models; metallic
                 state; Metallic state; Particle-Particle Attraction;
                 Superconducting Materials; superconductors; two-;
                 Two-band model",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "High-temperature superconductors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Hewat:1989:ODS,
  author =       "Alan W. Hewat and Elizabeth A. Hewat and Pierre Bordet
                 and Jean-Jacques Capponi and Catherine Chaillout and
                 Jean Chenavas and Jean-Louis Hodeau and Massimo Marezio
                 and Pierre Strobel and Michel Fran{\c{c}}ois and Klaus
                 Yvon and Peter Fischer and J.-L. Tholence",
  title =        "Oxygen ``disorder'' and the structures of high-{T}$_c$
                 superconductors by neutron powder diffraction",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "220--227",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "All of the high-T$_c$ perovskite superconductors
                 appear to show disorder of certain oxygen atoms. In
                 (La,Sr)$_2$CuO$_4$ and perhaps also in YBa/sub
                 2/Cu$_3$O$_7$ this is associated with a structural
                 transition. The Bi and Tl superconductors, for which
                 the authors now have neutron structural data on four
                 different phases, also show oxygen `disorder' which may
                 be associated with valence fluctuations. In
                 Tl$_2$Ba$_2$CuO$_6$, electron holes are created by the
                 absence of 1/8 of the atoms in the TlO plane, producing
                 a marked superstructure. However, this material is not
                 superconducting if the superstructure is well ordered,
                 with an orthorhombic (strictly monoclinic) structure.
                 The T$_c$ appears to depend on the disorder of the
                 superstructure to produce a pseudotetragonal metric in
                 which the oxygen atoms within the TlO plane are
                 distributed over four equivalent sites about the center
                 of the Tl square.",
  acknowledgement = ack-nhfb,
  affiliation =  "Inst. Max von Laue-Paul Langevin, Grenoble, France",
  affiliationaddress = "Grenoble, Fr",
  chemicalindex = "BiCaSrCuO/ss Bi/ss Ca/ss Cu/ss Sr/ss O/ss;
                 TlCaBaCuO/ss Ba/ss Ca/ss Cu/ss Tl/ss O/ss; LaSrCuO4/ss
                 Cu/ss La/ss O4/ss Sr/ss O/ss; YBa2Cu3O7/ss Ba2/ss
                 Cu3/ss Ba/ss Cu/ss O7/ss O/ss Y/ss; Tl2Ba2CuO6/ss
                 Ba2/ss Tl2/ss Ba/ss Cu/ss O6/ss Tl/ss O/ss",
  classcodes =   "A6160 (Specific structure of inorganic compounds);
                 A7470V (Perovskite phase superconductors)",
  classification = "701; 708; 804; 932; A6160 (Specific structure of
                 inorganic compounds); A7470V (Perovskite phase
                 superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Inst. Max von Laue-Paul Langevin, Grenoble, France",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(LaSr)$_2$CuO$_4$; (LaSr)$_2$CuO/sub 4/; BiCaSrCuO;
                 crystal atomic structure of inorganic compounds;
                 design, High temperature superconductors; diffraction;
                 disorder; Disorder; high temperature superconductors;
                 High Temperature Superconductors; high-; measurement;
                 neutron diffraction examination; neutron powder;
                 Neutron powder diffraction; Neutron Powder Diffraction;
                 Neutrons--Diffraction; of materials; performance;
                 perovskite superconductors; Perovskite superconductors;
                 Perovskite Superconductors; Powders; Pseudotetragonal
                 Metric; structural; Structural transition; Structure;
                 structures; Structures; Superconducting Materials;
                 superstructure; Superstructure; temperature
                 superconductors; Tl$_2$Ba$_2$CuO$_6$;
                 Tl$_2$Ba$_2$CuO/sub 6/; TlCaBaCuO; transition; valence
                 fluctuations; Valence fluctuations; YBa$_2$Cu$_3$O$_7$;
                 YBa/sub 2/Cu/sub 3/O/sub 7/",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Crystal atomic structure of inorganic compounds;
                 High-temperature superconductors; Neutron diffraction
                 examination of materials",
  treatment =    "X Experimental",
}

@Article{Beyers:1989:TSO,
  author =       "Robert B. Beyers and Stuart S. P. Parkin and Victor Y.
                 Lee and Adel L. Nazzal and Richard J. Savoy and G. L.
                 Gorman and T. C. Huang and S. J. {La Placa}",
  title =        "{Tl-Ca-Ba-Cu-O} superconducting oxides",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "228--237",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper reviews structural studies of Tl-Ca-Ba-Cu-O
                 superconducting oxides by the authors and others and
                 points out directions for future work.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Centre",
  affiliationaddress = "San Jose, CA, USA",
  chemicalindex = "TlCaBaCuO/ss Ba/ss Ca/ss Cu/ss Tl/ss O/ss",
  classcodes =   "A6160 (Specific structure of inorganic compounds);
                 A7470V (Perovskite phase superconductors)",
  classification = "701; 708; 804; 933; A6160 (Specific structure of
                 inorganic compounds); A7470V (Perovskite phase
                 superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Almaden Res. Centre, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "barium compounds; calcium compounds; Copper
                 Oxide--Electric Conductivity; crystal atomic; High
                 temperature superconductors; high temperature
                 superconductors; high-temperature; Layered Copper
                 Oxides; Oxides; Structural studies; structural studies;
                 Structure; structure of inorganic compounds;
                 Superconducting Materials; Superconducting Oxides;
                 superconducting oxides; Superconducting oxides;
                 superconductors; thallium compounds; Thallium
                 Compounds--Electric Conductivity; Tl-Ca-Ba-Cu-O",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; Calcium compounds; Crystal atomic
                 structure of inorganic compounds; High-temperature
                 superconductors; Thallium compounds",
  treatment =    "X Experimental",
}

@Article{Collins:1989:ISN,
  author =       "Reuben T. Collins and Zack Schlesinger and Frederic H.
                 Holtzberg and Praveen Chaudhari and Christopher A.
                 Feild",
  title =        "Infrared studies of the normal and superconducting
                 states of {Y}$_1$Ba$_2$Cu$_3${O}$_7$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "238--245",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We describe infrared measurements of the a-b-plane
                 response of Y$_1$Ba$_2$Cu$_3$O$_7$ crystals with T$_c$
                 \$APEQ 92 K. We observe a self-energy structure at a
                 characteristic energy of 500 cm\$+\$MIN@1\$/ (8kT$_c$),
                 the appearance of which coincides with the transition
                 to the superconducting state. The nature of this
                 self-energy anomaly is consistent with its
                 identification as a nodeless a-b-plane energy gap at
                 2\$Delta \$APEQ 8kT$_c$. On the basis of
                 temperature-dependent measurements above T$_c$, we
                 suggest that the normal state can be primarily
                 characterized by a carrier band with an enhanced
                 low-frequency mass and a frequency-dependent scattering
                 rate. Our data indicate that these arise from coupling
                 to an excitation spectrum with characteristic
                 frequencies up to \$omega$_c$ approximately 700
                 cm\$+\$MIN@1\$/ and a coupling strength of \$lambda
                 \$APEQ 2-3.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre",
  affiliationaddress = "Yorktown Heights, NY, USA",
  chemicalindex = "Y1Ba2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss Y1/ss
                 O/ss Y/ss",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7470V
                 (Perovskite phase superconductors); A7830G (Infrared
                 and Raman spectra in inorganic crystals)",
  classification = "701; 708; 741; 804; 812; 933; A7430G (Response to
                 electromagnetic fields, nuclear magnetic resonance,
                 ultrasonic attenuation); A7470V (Perovskite phase
                 superconductors); A7830G (Infrared and Raman spectra in
                 inorganic crystals)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Height, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "92 K; barium compounds; Ceramic Materials; coupling;
                 Coupling strength; design; Energy gap; energy gap;
                 Excitation spectrum; excitation spectrum; High
                 temperature superconductor; high temperature
                 superconductor; High Temperature Superconductors;
                 high-temperature superconductors; infrared; Infrared
                 Measurements; infrared measurements; Infrared
                 measurements; Infrared Radiation; mass; Mass;
                 measurement; normal; Normal state; Normal State;
                 Oxides; performance; Physical Properties; scattering
                 rate; Scattering rate; self-energy; Self-energy;
                 Self-Energy Anomaly; spectra of inorganic solids;
                 state; strength; superconducting energy gap;
                 Superconducting Materials; superconducting states;
                 Superconducting States; Superconducting states;
                 Y$_1$Ba$_2$Cu$_3$O$_7$, experimentation; Y/sub
                 1/Ba$_2$Cu/sub 3/O/sub 7/; Yttrium Barium Copper Oxide;
                 yttrium compounds; Yttrium Compounds--Electric
                 Conductivity",
  numericalindex = "Temperature 9.2E+01 K",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; High-temperature superconductors;
                 Infrared spectra of inorganic solids; Superconducting
                 energy gap; Yttrium compounds",
  treatment =    "X Experimental",
}

@Article{Emery:1989:NHS,
  author =       "Victor J. Emery",
  title =        "On the nature of high-temperature superconductivity",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "246--251",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A picture of the electronic structure, magnetism, and
                 superconductivity in high-T$_c$ oxides is obtained from
                 a simple analysis of experiments and models of the
                 copper oxide planes. It is shown that magnetism is
                 associated with holes on copper and superconductivity
                 with holes on oxygen. The pairing force is not
                 retarded. Questions about the motion of charges in an
                 antiferromagnetic background and the many-body theory
                 of high-temperature superconductivity are discussed.
                 Differences between the cuprates and doped BaBiO$_3$
                 are emphasized.",
  acknowledgement = ack-nhfb,
  affiliation =  "Brookhaven Nat. Lab.",
  affiliationaddress = "Upton, NY, USA",
  chemicalindex = "Cu/ss O/ss; BaBiO3/ss Ba/ss Bi/ss O3/ss O/ss",
  classcodes =   "A7420 (Theory); A7470V (Perovskite phase
                 superconductors)",
  classification = "701; 708; 804; 933; A7420 (Theory); A7470V
                 (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Brookhaven Nat. Lab., Upton, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Antiferromagnetic; antiferromagnetic;
                 antiferromagnetic properties of substances; band
                 structure; Barium Compounds--Electric Conductivity;
                 body theory; Cuprates; cuprates; design,
                 High-temperature superconductivity; Doped BaBiO$_3$;
                 doped BaBiO/sub 3/; Electronic Properties; Electronic
                 structure; electronic structure; high-;
                 High-Temperature; high-temperature superconductivity;
                 Magnetism; magnetism; many-; Many-body theory;
                 Many-Body Theory; of crystalline semiconductors and
                 insulators; Oxides; oxides; pairing force; Pairing
                 Force; Pairing force; performance; Superconductivity;
                 temperature superconductors",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Antiferromagnetic properties of substances; Band
                 structure of crystalline semiconductors and insulators;
                 High-temperature superconductors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kapitulnik:1989:MTH,
  author =       "Aharon Kapitulnik and Kookrin Char",
  title =        "Measurements on thin-film high-{T}$_c$
                 superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "252--261",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We report on the fabrication and properties of
                 high-T$_c$ superconducting films, and discuss the
                 possible origin of the linear resistivity. We discuss
                 the c-axis conductivity and present data to show that
                 the coherence length is 12 Angstrom parallel to the
                 plane and 2 Angstrom perpendicular to the plane in the
                 superconducting state. Tunneling data show that the
                 energy gap is large.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Appl. Phys.",
  affiliationaddress = "Stanford, CA, USA",
  classcodes =   "A7475 (Superconducting films); A7470V (Perovskite
                 phase superconductors); A7450 (Proximity effects,
                 tunnelling phenomena, and Josephson effect)",
  classification = "539; 701; 708; 804; 812; 942; A7450 (Proximity
                 effects, tunnelling phenomena, and Josephson effect);
                 A7470V (Perovskite phase superconductors); A7475
                 (Superconducting films)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Dept. of Appl. Phys., Stanford Univ., CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Anisotropy; anisotropy; C-Axis Conductivity; Ceramic
                 Materials; coherence; coherence length; Coherence
                 Length; Coherence length; conductivity; Conductivity;
                 design, High temperature superconductors; Electric
                 Measurements; Energy Gap; Fabrication; fabrication;
                 High Temperature Superconductors; high temperature
                 superconductors; high-temperature superconductors;
                 length; Linear Resistivity; measurement; Oxides;
                 performance; resistivity; Resistivity; Superconducting
                 Materials; superconducting thin films; superconductive
                 tunnelling; Thin Films; thin-film; Thin-film;
                 tunneling; Tunneling; Yttrium Barium Copper Oxide",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Coherence length; High-temperature superconductors;
                 Superconducting thin films; Superconductive
                 tunnelling",
  treatment =    "X Experimental",
}

@Article{Gough:1989:GJQ,
  author =       "C. E. Gough",
  title =        "Granular {Josephson} and quantum interference effects
                 in {HTC} ceramic superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "262--269",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Josephson effects in high-T$_c$ superconductors are
                 briefly reviewed, with specific reference to granular
                 ceramic materials and SQUID device applications. It is
                 suggested that the inductance associated with
                 intergranular current loops may play an important role,
                 even in determining the bulk superconductivity
                 properties, as in weak-link superconducting rings.
                 Evidence for quantum interference effects within
                 intergranular current loops is presented. In ultra-low
                 fields, the observed temperature dependence of
                 thermally activated flux creep cannot be described by a
                 simple granular superconductor model of equally spaced
                 pinning centers, but would seem to imply a hierarchy of
                 pinning sites of variable strength. The development of
                 liquid-nitrogen-cooled RF and DC SQUIDs is described,
                 and the noise levels currently achieved are
                 presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "Supercond. Res. Group, Birmingham Univ., UK",
  classcodes =   "A7450 (Proximity effects, tunnelling phenomena, and
                 Josephson effect); A7470V (Perovskite phase
                 superconductors); A7460G (Flux pinning, flux motion,
                 fluxon-defect interactions); A7470M (Amorphous, highly
                 disordered, and granular superconductors)",
  classification = "701; 704; 708; 741; 804; 812; 933; A7450 (Proximity
                 effects, tunnelling phenomena, and Josephson effect);
                 A7460G (Flux pinning, flux motion, fluxon-defect
                 interactions); A7470M (Amorphous, highly disordered,
                 and granular superconductors); A7470V (Perovskite phase
                 superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Supercond. Res. Group, Birmingham Univ., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Bulk Superconductivity; Ceramic Materials; ceramic
                 superconductors; Ceramic superconductors; design, High
                 temperature superconductors; Electric Conductivity;
                 electron device noise; flux creep; Flux creep; flux
                 pinning; granular ceramic materials; Granular Ceramic
                 Materials; Granular ceramic materials; Granular
                 Materials; granular superconductor; Granular
                 superconductor; High Temperature Superconductivity;
                 high temperature superconductors; High Temperature
                 Superconductors; high-; inductance; Inductance;
                 Infrared Measurements; intergranular current loops;
                 Intergranular current loops; Josephson effect;
                 Josephson effects; Josephson Effects; Josephson
                 effects; measurement; noise; Noise; Normal State;
                 performance; pinning; Pinning; quantum interference;
                 Quantum interference; Quantum Interference Effects;
                 Self-Energy Anomaly; SQUID; squid Device; SQUIDs;
                 Superconducting Devices--Josephson Junctions;
                 Superconducting Materials; superconducting rings;
                 Superconducting States; temperature superconductors;
                 weak-link; Weak-link superconducting rings; Yttrium
                 Barium Copper Oxide",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Electron device noise; Flux creep; Flux pinning;
                 High-temperature superconductors; Josephson effect;
                 SQUIDs",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Birgeneau:1989:QEI,
  author =       "Robert T. Birgeneau and Yasuo Endoh and Y. Hidaka and
                 Kazuhisa Kakurai and Marc A. Kastner and T. Murakami
                 and Gen Shirane and Thomas R. Thurston and Kazuyoshi
                 Yamada",
  title =        "Quasi-elastic and inelastic neutron-scattering studies
                 of superconducting {La}$_{2-x}${Sr}$_x$/{CuO}$_4$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "270--276 (or 270--275??)",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We review the results of recent neutron-scattering
                 studies of the spin fluctuations in samples of
                 La$_{1.89}$Sr$_{0.11}$CuO$_4$ which are approximately
                 80\% superconducting with T$_c$ $=$ 10 K. The structure
                 factor, S(Q), reflects three-dimensional modulated spin
                 correlations with an in-plane correlation length of
                 order 18 \$POM 6 Angstrom. The fluctuations evolve with
                 temperature from being predominantly dynamic at high
                 temperatures to mainly quasi-elastic
                 (\$VBAR\$Delta@E\$VBAR \$LS 0.5 meV) at low
                 temperatures. No significant differences are observed
                 in the normal and superconducting states.",
  acknowledgement = ack-nhfb,
  affiliation =  "MIT",
  affiliationaddress = "Cambridge, MA, USA",
  chemicalindex = "La1.89Sr0.11CuO4/ss La1.89/ss Sr0.11/ss Cu/ss La/ss
                 O4/ss Sr/ss O/ss",
  classcodes =   "A7525 (Spin arrangements in magnetically ordered
                 materials); A7470V (Perovskite phase superconductors);
                 A7540G (Dynamic properties)",
  classification = "701; 708; 804; 932; A7470V (Perovskite phase
                 superconductors); A7525 (Spin arrangements in
                 magnetically ordered materials); A7540G (Dynamic
                 properties)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "MIT, Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "1.89/Sr/sub 0.11/CuO/sub 4/; 10 K; High temperature
                 superconductor; high temperature superconductor;
                 high-temperature superconductors; Inelastic
                 neutron-scattering; inelastic neutron-scattering;
                 La$_{1.89}$Sr$_{0.11}$CuO$_4$; La/sub; lanthanum
                 compounds; Lanthanum Compounds--Electric Conductivity;
                 Modulated Spin Correlations; neutron diffraction
                 examination of materials; Neutrons--Scattering;
                 Physical Properties; quasielastic neutron; Quasielastic
                 neutron scattering; scattering; spin correlations; Spin
                 correlations; spin dynamics; Spin Fluctuations; spin
                 fluctuations; Spin fluctuations; strontium compounds;
                 Structure factor; structure factor; Superconducting
                 Materials; Superconducting States",
  numericalindex = "Temperature 1.0E+01 K",
  thesaurus =    "High-temperature superconductors; Lanthanum compounds;
                 Neutron diffraction examination of materials; Spin
                 dynamics; Strontium compounds",
  treatment =    "X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
  xxnote =       "Check page numbers: conflict with
                 \cite{Endoch:1989:QIN}.",
}

@Article{Endoch:1989:QIN,
  author =       "Yasuo Endoch and Y. Hidaka and Kazuhisa Kakurai and
                 Marc A. Kastner and T. Murakami",
  title =        "Quasi-elastic and inelastic neutron-scattering studies
                 of superconducting La$_{2-x}${Sr}$_x${CuO}$_4$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "270--276",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun May 02 08:07:07 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Deutscher:1989:SS}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; experimentation; measurement; performance",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  xxnote =       "Check page numbers: conflict with
                 \cite{Birgeneau:1989:QEI}.",
}

@Article{Kitaoka:1989:NSM,
  author =       "Y. Kitaoka and K. Ishida and K. Fujiwara and K.
                 Asayama and H. Yoshida Katayama and Y. Okabe and T.
                 Takahashi",
  title =        "{NMR} study of magnetism and superconductivity in
                 high-{T}$_c$ oxides",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "277--285",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The results of $^{139}$La and $^{63}$Cu nuclear
                 quadrupole resonance (NQR) on La-Ba, Sr-Cu-O,
                 Y-Ba-Cu-O, and Bi-Pb-Sr-Ca-Cu-O compounds and of
                 $^{17}$O nuclear magnetic resonance (NMR) on Y-Ba-Cu-O
                 are reviewed. As for the magnetism, the phase diagram
                 for the La system studied by a $^{139}$La NQR
                 experiment is presented, with evidence of the
                 disordered magnetic state between the
                 3D-antiferromagnetic (AF) ordered state and the
                 superconducting state. With respect to its
                 superconducting nature, the nuclear spin-lattice
                 relaxation behavior (T$_1$) of Cu in the CuO$_2$ plane
                 has been found to be unconventional above and below
                 T$_c$ for all compounds, with no signatures expected
                 for a nonmagnetic metal and a BCS superconductor,
                 respectively. The behavior of T$_1$ of Cu above T$_c$
                 is shown to be dominated by AF fluctuation of Cu d
                 spins. In contrast, an enhancement of 1/T$_1$ of
                 $^{17}$O has been observed just below T$_c$, which is
                 similar to a BCS case.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Mater. Phys., Osaka Univ.",
  affiliationaddress = "Toyonaka, Jpn",
  chemicalindex = "LaBaSrCuO/ss Ba/ss Cu/ss La/ss Sr/ss O/ss;
                 BiPbSrCaCuO/ss Bi/ss Ca/ss Cu/ss Pb/ss Sr/ss O/ss;
                 YBaCuO/ss Ba/ss Cu/ss O/ss Y/ss",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7470V
                 (Perovskite phase superconductors); A7660E (Relaxation
                 effects); A7660G (Quadrupole resonance); A7550E
                 (Antiferromagnetics); A7430C (Magnetization curves,
                 Meissner effect, penetration depth); A7470H (Magnetic
                 superconductors); A7530K (Magnetic phase boundaries)",
  classification = "701; 708; 804; 931; A7430C (Magnetization curves,
                 Meissner effect, penetration depth); A7430G (Response
                 to electromagnetic fields, nuclear magnetic resonance,
                 ultrasonic attenuation); A7470H (Magnetic
                 superconductors); A7470V (Perovskite phase
                 superconductors); A7530K (Magnetic phase boundaries);
                 A7550E (Antiferromagnetics); A7660E (Relaxation
                 effects); A7660G (Quadrupole resonance)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Dept. of Mater. Phys., Osaka Univ., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "/sup 139/La; /Sup 139/La; /sup 17/O; /Sup 17/O; /sup
                 63/Cu; /Sup 63/Cu; antiferromagnetic; Antiferromagnetic
                 fluctuations; antiferromagnetic properties of
                 substances; Ba-Cu-O; BCS superconductor;
                 Bi-Pb-Sr-Ca-Cu-O; design, High temperature
                 superconductors; disordered magnetic state; Disordered
                 Magnetic State; Disordered magnetic state;
                 fluctuations; High Temperature Superconductivity; high
                 temperature superconductors; high-temperature;
                 La-Ba-Sr-Cu-O; magnetic; Magnetic Properties; magnetic
                 superconductors; magnetism; Magnetism; measurement;
                 NMR; nonmagnetic metal; Nonmagnetic metal; Nonmagnetic
                 Metal; NQR; nuclear magnetic resonance; Nuclear
                 Magnetic Resonance; nuclear quadrupole; Nuclear
                 Quadrupole Resonance (NQR); nuclear spin-lattice
                 relaxation; Nuclear spin-lattice relaxation; oxides;
                 Oxides; performance; phase diagram; Phase diagram;
                 resonance; Spin-Lattice Relaxation; Superconducting
                 Materials; Superconducting State; superconductivity;
                 Superconductivity; superconductors; transitions; Y-;
                 Y-Ba-Cu-O",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Antiferromagnetic properties of substances;
                 High-temperature superconductors; Magnetic
                 superconductors; Magnetic transitions; Nuclear magnetic
                 resonance; Nuclear quadrupole resonance; Nuclear
                 spin-lattice relaxation",
  treatment =    "X Experimental",
  xxauthor =     "Y. Kitaoka and K. Ishida and K. Fujiwara and K.
                 Asayama and H. Katayama-Yoshida and Y. Okabe and T.
                 Takahashi",
  xxnote =       "Check authors??",
}

@Article{Aharony:1989:MFM,
  author =       "Amnon Aharony and Robert J. Birgeneau and Marc A.
                 Kastner",
  title =        "Magnetic frustration model and superconductivity in
                 doped planar {CuO}$_2$ systems",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "287--292",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We present a model for the magnetic phases and
                 superconductivity in doped planar CuO$_2$ systems.
                 Electronic holes on the oxygen ions introduce local
                 ferromagnetic exchange couplings between the Cu spins.
                 The resulting frustration destroys the
                 antiferromagnetic state characterizing the undoped
                 planes, and generates a new spin-glass phase. This
                 frustration also yields an attractive interaction
                 between the holes, whose range decreases with
                 increasing doping. We use the BCS approximation to
                 obtain an estimate of the superconducting transition
                 temperature T$_c$(x) for
                 La\$-2\$MINx\$/Sr$_x$CuO$_4$.",
  acknowledgement = ack-nhfb,
  affiliation =  "Raymond and Beverley Sackler Fac. of Exact Sci.",
  affiliationaddress = "Tel Aviv, Isr",
  chemicalindex = "Cu/ss O/ss; LaSrCuO4/ss Cu/ss La/ss O4/ss Sr/ss
                 O/ss",
  classcodes =   "A7420F (BCS theory and its applications); A7470V
                 (Perovskite phase superconductors); A7550E
                 (Antiferromagnetics); A7410 (Occurrence, critical
                 temperature); A7470H (Magnetic superconductors); A7550L
                 (Spin glasses)",
  classification = "701; 708; 804; A7410 (Occurrence, critical
                 temperature); A7420F (BCS theory and its applications);
                 A7470H (Magnetic superconductors); A7470V (Perovskite
                 phase superconductors); A7550E (Antiferromagnetics);
                 A7550L (Spin glasses)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Raymond and Beverley Sackler Fac. of Exact Sci., Tel
                 Aviv Univ., Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Antiferromagnetic state; antiferromagnetic state; BCS
                 approximation; BCS theory; Copper Oxide--Magnetic
                 Properties; Doped planar CuO$_2$ systems; doped planar
                 CuO$_2$ systems; Ferromagnetic exchange; ferromagnetic
                 exchange; Ferromagnetic Exchange Couplings;
                 ferromagnetic properties of substances; glasses; High
                 temperature superconductors; high temperature
                 superconductors; High Temperature Superconductors;
                 high-; holes; Holes; La/sub 2-x/Sr$_x$CuO$_4$; La/sub
                 2-x/Sr$_x$CuO/sub 4/; Magnetic Frustration; Magnetic
                 frustration; magnetic frustration; Magnetic Phases;
                 Magnetic Properties; magnetic superconductors;
                 Magnetism--Ferromagnetism; measurement; performance;
                 phase; spin; spin-glass; Spin-glass phase; Spin-Glass
                 Phase; Superconducting Materials; superconducting
                 transition; superconducting transition temperature;
                 Superconducting transition temperature; Superconducting
                 Transition Temperature; superconductivity;
                 Superconductivity; temperature; temperature
                 superconductors",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "BCS theory; Ferromagnetic properties of substances;
                 High-temperature superconductors; Magnetic
                 superconductors; Spin glasses; Superconducting
                 transition temperature",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Deutscher:1989:SS,
  author =       "Guy Deutscher and Kazuyoshi Yamada",
  title =        "Short-coherence-length superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "293--298",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "We review the results of recent neutron-scattering
                 studies of the spin fluctuations in samples of
                 La$_{1.89}$Sr$_{0.11}$CuO$_4$ which are approximately
                 80\% superconducting with T$_c$ $=$ 10 K. The structure
                 factor, S(Q), reflects three-dimensional modulated spin
                 correlations with an in-plane correlation length of
                 order 18 \$POM 6 Angstrom. The fluctuations evolve with
                 temperature from being predominantly dynamic at high
                 temperatures to mainly quasi-elastic
                 (\$VBAR\$Delta@E\$VBAR \$LS 0.5 meV) at low
                 temperatures. No significant differences are observed
                 in the normal and superconducting states.",
  abstract-2 =   "The new high-T$_c$ oxides present some anomalous
                 electromagnetic properties, such as low critical
                 current densities, a reversible behavior of the
                 magnetization at fields much lower than H$_{c2}$, and
                 internal Josephson effects, that distinguish them from
                 the conventional low-T$_c$ metals and alloys. These
                 anomalous properties were first observed in
                 bulk-sintered samples and were often ascribed to the
                 poor connectivity of these ceramics. More recently, a
                 qualitatively similar behavior has been observed in
                 single crystals and oriented films. The fundamental
                 role of the short coherence length in determining the
                 behavior of the high-T$_c$ oxides is discussed. The
                 authors show that the short coherence lengths at the
                 local depressions of the order parameter at
                 crystallographic defects lead to reduced critical
                 currents and cause glassy behavior in the vicinity of
                 T$_c$.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Phys. and Astron., Tel Aviv Univ., Israel",
  classcodes =   "A7460J (Critical currents); A7430C (Magnetization
                 curves, Meissner effect, penetration depth); A7450
                 (Proximity effects, tunnelling phenomena, and Josephson
                 effect); A7470V (Perovskite phase superconductors)",
  classification = "701; 708; 804; 932; 933; A7430C (Magnetization
                 curves, Meissner effect, penetration depth); A7450
                 (Proximity effects, tunnelling phenomena, and Josephson
                 effect); A7460J (Critical currents); A7470V (Perovskite
                 phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Dept. of Phys. and Astron., Tel Aviv Univ., Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(superconductivity); Ceramics; ceramics; Coherence
                 length; coherence length; Critical current densities;
                 critical current densities; critical current density;
                 crystallographic; Crystallographic defects;
                 Crystals--Electric Conductivity; Current Densities;
                 defects; electromagnetic; Electromagnetic properties;
                 experimentation; films; glassy; Glassy, measurement;
                 high temperature superconductors; High temperature
                 superconductors; High Temperature Superconductors;
                 high-temperature superconductors; Internal Josephson
                 Effects; Josephson effect; Josephson effects; Lanthanum
                 Compounds--Electric Conductivity; magnetisation;
                 magnetization; Magnetization; Modulated Spin
                 Correlations; Neutrons--Scattering; order parameter;
                 Order parameter; oriented; Oriented films; Oriented
                 Films; Oxides; oxides; performance; Physical
                 Properties; properties; Short-Coherence-Length
                 Superconductors; Single crystals; single crystals;
                 Single Crystals; Spin Fluctuations; Superconducting
                 Materials; Superconducting States",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Coherence length; Critical current density
                 [superconductivity]; High-temperature superconductors;
                 Josephson effect; Magnetisation",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
  xxnote =       "Check page numbers: conflict between
                 \cite{Deutscher:1989:SS,Birgeneau:1989:QIN,Endoch:1989:QIN}.",
}

@Article{Chaudhari:1989:CCM,
  author =       "Praveen Chaudhari and Duane Dimos and Jochen
                 Mannhart",
  title =        "Critical current measurements in single crystals and
                 single-grain boundaries in {YBa}$_2$Cu$_3${O}$_7$
                 films",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "299--306",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The temperature, magnetic field, and orientation
                 dependence of the critical current density of
                 superconducting YBa$_2$Cu$_3$O$_7$ films have been
                 determined from transport measurements. The results
                 support a model of flux creep within single grains and
                 weak-link coupling across grain boundaries.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  affiliationaddress = "Yorktown Heights, NY, USA",
  chemicalindex = "YBa2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss O/ss
                 Y/ss",
  classcodes =   "A7460J (Critical currents); A7470V (Perovskite phase
                 superconductors); A7475 (Superconducting films); A7460G
                 (Flux pinning, flux motion, fluxon-defect
                 interactions)",
  classification = "701; 708; 804; 812; 933; 942; A7460G (Flux pinning,
                 flux motion, fluxon-defect interactions); A7460J
                 (Critical currents); A7470V (Perovskite phase
                 superconductors); A7475 (Superconducting films)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(superconductivity); barium compounds; Ceramic
                 Materials; creep; Critical current density; critical
                 current density; Critical Current Measurements;
                 Crystals--Physical Properties; design, High temperature
                 superconductor; Electric Measurements--Current;
                 Electric Properties; experimentation; flux; Flux creep;
                 Flux Creep; flux creep; grain boundaries; high
                 temperature superconductor; High Temperature
                 Superconductors; high-; measurement; Oxides;
                 performance; Single Crystals; single crystals; Single
                 crystals; single-; Single-grain boundaries;
                 Single-Grain Boundaries; Superconducting Materials;
                 superconducting thin films; temperature
                 superconductors; Transport; transport; Weak-link
                 coupling; weak-link coupling; YBa$_2$Cu$_3$O$_7$ films;
                 YBa$_2$Cu/sub 3/O/sub 7/ films; Yttrium Barium Copper
                 Oxide; yttrium compounds; Yttrium Compounds--Thin
                 Films",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; Critical current density
                 [superconductivity]; Flux creep; Grain boundaries;
                 High-temperature superconductors; Superconducting thin
                 films; Yttrium compounds",
  treatment =    "X Experimental",
}

@Article{Morgenstern:1989:GBH,
  author =       "I. Morgenstern",
  title =        "Glassy behavior of high-{T}$_c$ superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "307--313",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper deals with the question of flux creep or
                 glassy behavior in high-T$_c$ superconducting single
                 crystals. It is shown that the flux creep picture is
                 merely a phenomenological approach to the glassy
                 behavior for relatively short times and low
                 temperatures. Glassy effects are predicted for
                 temperatures between 70\% and 95\% T$_c$ and magnetic
                 fields in the range of 0.03 T to 0.2 T. The glass
                 concept can be understood as a generalization of the
                 traditional flux creep picture. A hierarchy of energy
                 barriers dominates the physical behavior. An important
                 technical aspect is the influence of the glassiness on
                 critical currents.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab.",
  affiliationaddress = "Zurich, Switz",
  classcodes =   "A7460G (Flux pinning, flux motion, fluxon-defect
                 interactions); A7470V (Perovskite phase
                 superconductors); A7460J (Critical currents)",
  classification = "701; 708; 812; 933; A7460G (Flux pinning, flux
                 motion, fluxon-defect interactions); A7460J (Critical
                 currents); A7470V (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "behavior; critical; critical currents; Critical
                 Currents; Critical currents; Crystals; currents;
                 design, High temperature superconductors; energy
                 barriers; Energy barriers; experimentation; flux creep;
                 Flux Creep; Flux creep; Glass--Electric Conductivity;
                 Glassiness; glassy; Glassy behavior; high temperature
                 superconductors; High Temperature Superconductors;
                 high-temperature; measurement; performance; Physical
                 Properties; single crystals; Single Crystals; Single
                 crystals; Superconducting Materials; superconductors",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Critical currents; Flux creep; High-temperature
                 superconductors",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Keller:1989:MRE,
  author =       "Hugo Keller",
  title =        "Muon-spin rotation experiments in high-{T}$_c$
                 superconductors and related materials",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "314--323",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Recent muon-spin rotation $\mu$SR experiments in
                 high-T$_c$ superconductors and related
                 antiferromagnetic materials are reviewed. The
                 possibilities and the limitations of the $\mu$SR method
                 for investigating these materials are briefly
                 discussed. In a high-T$_c$ superconductor, $\mu$SR is
                 an ideal tool with which to study the local magnetic
                 field distribution at the muon site, allowing a
                 determination of the London penetration depth. It is
                 further shown that $\mu$SR experiments may contribute
                 to the microscopic understanding of the superconducting
                 glass state in the high-T$_c$ oxides. In the related
                 antiferromagnetic materials $\mu$SR is a sensitive
                 method for detecting frozen local magnetic moments.",
  acknowledgement = ack-nhfb,
  affiliation =  "Phys. Inst., Zurich Univ.",
  affiliationaddress = "Zurich, Switz",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7470V
                 (Perovskite phase superconductors); A7430C
                 (Magnetization curves, Meissner effect, penetration
                 depth); A7675 (Muon spin rotation and relaxation);
                 A7550E (Antiferromagnetics)",
  classification = "701; 708; A7430C (Magnetization curves, Meissner
                 effect, penetration depth); A7430G (Response to
                 electromagnetic fields, nuclear magnetic resonance,
                 ultrasonic attenuation); A7470V (Perovskite phase
                 superconductors); A7550E (Antiferromagnetics); A7675
                 (Muon spin rotation and relaxation)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Phys. Inst., Zurich Univ., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "(superconductivity); Antiferromagnetic materials;
                 antiferromagnetic materials; antiferromagnetic
                 properties of substances; design, High temperature
                 superconductors; experimentation; high temperature
                 superconductors; High Temperature Superconductors;
                 high-temperature; Local magnetic moments; local
                 magnetic moments; London penetration depth; Magnetic
                 Field Distribution; Magnetic
                 Materials--Antiferromagnetism; Magnetic Moments;
                 measurement; muon probes; Muon-Spin Rotation; Muon-spin
                 rotation; muon-spin rotation; oxides; Oxides;
                 penetration depth; Penetration Depth; performance;
                 Physical Properties; superconducting glass state;
                 Superconducting glass state; Superconducting Glass
                 State; Superconducting Materials; superconductors",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Antiferromagnetic properties of substances;
                 High-temperature superconductors; Muon probes;
                 Penetration depth [superconductivity]",
  treatment =    "X Experimental",
}

@Article{Blazey:1989:LMA,
  author =       "Keith William Blazey and Frederic H. Holtzberg",
  title =        "Low-field microwave absorption in single-crystal
                 superconducting {YBa}$_2${Cu}$_5${O}$_{7-\delta}$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "324--327",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The low-field microwave absorption line spectrum of a
                 single crystal of superconducting YBa$_2$Cu/sub
                 3/O$_{7-\delta}$ has been studied as a function of the
                 external magnetic field. The threshold microwave power
                 necessary to nucleate fluxons is found to vary with
                 field in such a way that only about one thousandth of
                 the junction length is active in interacting with the
                 microwaves to create fluxons.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab.",
  affiliationaddress = "Rueschlikon, Switz",
  chemicalindex = "YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7470V
                 (Perovskite phase superconductors); A7460G (Flux
                 pinning, flux motion, fluxon-defect interactions)",
  classification = "701; 708; 804; 812; 933; A7430G (Response to
                 electromagnetic fields, nuclear magnetic resonance,
                 ultrasonic attenuation); A7460G (Flux pinning, flux
                 motion, fluxon-defect interactions); A7470V (Perovskite
                 phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "2/Cu/sub 3/O/sub 7- delta /; barium compounds; Ceramic
                 Materials; Crystals--Electric Conductivity; design,
                 High temperature superconductor; experimentation; flux
                 flow; fluxons; Fluxons; high temperature
                 superconductor; High Temperature Superconductors;
                 high-temperature; junction; Junction; Low-Field
                 Microwave Absorption; magnetic field; Magnetic field;
                 Magnetic Field Effects; measurement; Microwave
                 absorption; microwave absorption; Microwave Power;
                 Oxides; performance; Single Crystal; Single-crystal;
                 single-crystal; Superconducting Materials;
                 superconductors; YBa$_2$Cu$_3$O$_{7-\delta}$; YBa/sub;
                 Yttrium Barium Copper Oxide; yttrium compounds; Yttrium
                 Compounds--Electric Conductivity",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; Flux flow; High-temperature
                 superconductors; Yttrium compounds",
  treatment =    "X Experimental",
}

@Article{Maeno:1989:MEY,
  author =       "Yoshiteru Maeno and Christophe Rossel and Frederic H.
                 Holtzberg",
  title =        "Memory effects in {YBa}$_2${Cu}$_5${O}$_{7-\delta}$
                 single crystal",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "328--332",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements of the time dependence of
                 zero-field-cooled (ZFC) and field-cooled (FC)
                 magnetization M in YBa$_2$Cu$_3$O$_{7-\delta}$ single
                 crystal have been performed as a function of
                 temperature and magnetic field. The appearance of an
                 echo-like feature in the decay rate $S=dM/d \ln t$ at
                 an observing time $t$ equal to the waiting time $t_w$
                 during which the specimen was prepared at a given field
                 $H_0$ and temperature $T$ reveals aging effects in the
                 superconducting state. Similar phenomena reported in
                 spin glasses seem to validate the picture of a
                 superconducting glass state in
                 YBa$_2$Cu$_3${O}$_{7-\delta}$.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab.",
  affiliationaddress = "Rueschlikon, Switz",
  chemicalindex = "YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss",
  classcodes =   "A7430C (Magnetization curves, Meissner effect,
                 penetration depth); A7470V (Perovskite phase
                 superconductors)",
  classification = "701; 708; 804; 812; 933; A7430C (Magnetization
                 curves, Meissner effect, penetration depth); A7470V
                 (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "7- delta /; ageing; aging; Aging; barium compounds;
                 Ceramic Materials; crystal; Crystals--Magnetic
                 Properties; design; echo; Echo; experimentation;
                 field-cooled; Field-cooled; high temperature
                 superconductor; High temperature superconductor; High
                 Temperature Superconductors; high-temperature
                 superconductors; Magnetic Properties; magnetisation;
                 magnetization; Magnetization; measurement; memory;
                 Memory; Oxides; performance; single; Single crystal;
                 Single Crystal; Spin Glasses; Superconducting Glass;
                 superconducting glass state; Superconducting glass
                 state; Superconducting Materials; Superconducting
                 State; YBa$_2$Cu$_3$O$_{7-\delta}$; YBa$_2$Cu/sub
                 3/O/sub; Yttrium Barium Copper Oxide; yttrium
                 compounds; Yttrium Compounds--Electric Conductivity;
                 zero-field-cooled; Zero-field-cooled",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Ageing; Barium compounds; High-temperature
                 superconductors; Magnetisation; Yttrium compounds",
  treatment =    "X Experimental",
  xxauthor =     "C. Rossel and Y. Maeno and F. H. Holtzberg",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Peter:1989:PAH,
  author =       "Martin Peter",
  title =        "Positron annihilation and high-temperature
                 superconductivity",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "333--341",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "After a review of the theory of positron annihilation
                 techniques and of experimental principles, we give
                 examples of the determination of electron momentum
                 density and Fermi surfaces in alkali metals, transition
                 elements and compounds, and cerium. We discuss the
                 application of positrons in superconducting oxides. The
                 best results have been obtained in
                 YBa$_2$Cu$_3$O\$-7\$MIN@x\$/, with confirmation of
                 calculated band structure and observation of
                 discontinuity at the Fermi energy.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Phys. of Condensed Matter, Geneve Univ.",
  affiliationaddress = "Geneva, Switz",
  chemicalindex = "Ce/el; YBa2Cu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss
                 Y/ss",
  classcodes =   "A7870B (Positron annihilation); A7470V (Perovskite
                 phase superconductors); A7125H (Measurement of Fermi
                 surface parameters); A7125T (Band structure of
                 crystalline semiconductor compounds and insulators)",
  classification = "549; 701; 708; 804; 812; 932; A7125H (Measurement of
                 Fermi surface parameters); A7125T (Band structure of
                 crystalline semiconductor compounds and insulators);
                 A7470V (Perovskite phase superconductors); A7870B
                 (Positron annihilation)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Dept. of Phys. of Condensed Matter, Geneve Univ.,
                 Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Alkali metals; alkali metals; Alkali Metals--Electric
                 Conductivity; Band structure; Band Structure; band
                 structure; band structure of crystalline semiconductors
                 and insulators; Ce; Ceramic Materials; design, High
                 temperature superconductors; Electron Momentum Density;
                 Electron momentum density; electron momentum density;
                 experimentation; Fermi energy; Fermi level; Fermi
                 surface; Fermi surfaces; Fermi Surfaces; high
                 temperature superconductors; high-; high-temperature;
                 High-Temperature Superconductivity; High-temperature
                 superconductivity; measurement; Oxides; Particle Beams;
                 performance; Physical Properties; Positron
                 Annihilation; Positron annihilation; positron
                 annihilation; positron annihilation in liquids and
                 solids; Superconducting Materials; Superconducting
                 Oxides; Superconducting oxides; superconducting oxides;
                 superconductors; temperature superconductivity;
                 Transition compounds; transition compounds; Transition
                 elements; transition elements; YBa$_2$Cu$_3$O$_{7-x}$;
                 YBa$_2$Cu/sub 3/O/sub 7-x/; Yttrium Compounds--Electric
                 Conductivity",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Band structure of crystalline semiconductors and
                 insulators; Fermi level; Fermi surface;
                 High-temperature superconductors; Positron annihilation
                 in liquids and solids",
  treatment =    "B Bibliography; G General Review",
}

@Article{Mehring:1989:NMR,
  author =       "Michael Mehring",
  title =        "Nuclear magnetic resonance in high-{T}$_c$
                 superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "342--350",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "This paper is aimed at the nonspecialist in nuclear
                 magnetic resonance who wants to know what NMR can do to
                 increase his understanding of high-T$_c$
                 superconductors. Most NMR results are discussed in an
                 illustrative manner to facilitate intuitive
                 understanding. Several NMR experiments are presented
                 which demonstrate the variety of this experimental
                 technique. Emphasis is given to the following aspects:
                 ionic charges and quadrupole interaction, local fields
                 and magnetic ordering, conduction electrons and Knight
                 shifts, quasiparticle excitations, and nuclear
                 spin-lattice relaxation.",
  acknowledgement = ack-nhfb,
  affiliation =  "Physikalisches Inst., Stuttgart Univ.",
  affiliationaddress = "Stuttgart, West Ger",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7470V
                 (Perovskite phase superconductors); A7660E (Relaxation
                 effects); A7660C (Chemical and Knight shifts)",
  classification = "701; 708; 931; 932; A7430G (Response to
                 electromagnetic fields, nuclear magnetic resonance,
                 ultrasonic attenuation); A7470V (Perovskite phase
                 superconductors); A7660C (Chemical and Knight shifts);
                 A7660E (Relaxation effects)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Physikalisches Inst., Stuttgart Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Conduction electrons; conduction electrons; fields;
                 High Temperature Superconductors; high temperature
                 superconductors; high-temperature superconductors;
                 ionic charges; Ionic charges; Ionic Charges; Knight;
                 Knight shift; Knight shifts; Knight Shifts; local;
                 Local fields; magnetic ordering; Magnetic Ordering;
                 Magnetic ordering; magnetic resonance; measurement,
                 High temperature superconductors; NMR; nuclear; nuclear
                 magnetic; Nuclear magnetic resonance; Nuclear Magnetic
                 Resonance; nuclear spin-lattice; Nuclear spin-lattice
                 relaxation; nuclear spin-lattice relaxation; Nuclear
                 Spin-Lattice Relaxation; particles; performance;
                 Physical Properties; Quadrupole interaction; Quadrupole
                 Interaction; quadrupole interaction; quasi-;
                 quasiparticle excitations; Quasiparticle excitations;
                 relaxation; resonance; shifts; Superconducting
                 Materials",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "High-temperature superconductors; Knight shift;
                 Nuclear magnetic resonance; Nuclear spin-lattice
                 relaxation; Quasi-particles",
  treatment =    "G General Review",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Schneider:1989:CTG,
  author =       "T. Schneider",
  title =        "Critical temperature and the {Ginzburg--Landau} theory
                 of layered high-temperature superconductors",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "351--355",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Using the mean-field approximation, we study a model
                 for quasi-two-dimensional superconductors. The
                 interlayer coupling, assumed to be mediated by a small
                 electron-hopping term, is found to leave T$_c$
                 practically unaffected. Thus, a three-dimensional
                 pairing mechanism is required to explain the observed
                 rise in T$_c$ with decreasing average layer spacing in
                 the Bi and Tl compounds. Taking the inhomogeneities of
                 intrinsic or extrinsic nature into account, we find, in
                 the dirty limit, corrections to the conventional
                 anisotropic Ginzburg--Landau behavior-an upward
                 curvature of the upper critical fields which appears to
                 be a universal feature of layered superconductors.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab.",
  affiliationaddress = "Zurich, Switz",
  classcodes =   "A7420D (Phenomenological and two-fluid theories);
                 A7470V (Perovskite phase superconductors); A7460E
                 (Mixed state, H/sub c/sub 2, surface sheath); A7410
                 (Occurrence, critical temperature)",
  classification = "701; 708; 804; 933; A7410 (Occurrence, critical
                 temperature); A7420D (Phenomenological and two-fluid
                 theories); A7460E (Mixed state, H/sub c$_2$, surface
                 sheath); A7470V (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "anisotropic; Anisotropic; Bismuth Compounds--Electric
                 Conductivity; critical temperature; design, Critical
                 temperature; dirty limit; Dirty limit; dirty
                 superconductors; electron-hopping; Electron-hopping;
                 Ginzburg--Landau theory; Ginzburg--Landau Theory;
                 high-; High-Temperature Superconductors;
                 inhomogeneities; Inhomogeneities; Interlayer Coupling;
                 layered high-; Layered high-temperature
                 superconductors; Layered Superconductors; mean-field
                 approximation; Mean-field approximation; measurement;
                 pairing; Pairing; Physical Properties; quasi-;
                 Quasi-two-dimensional; Quasi-Two-Dimensional
                 Superconductors; superconducting critical field;
                 Superconducting Materials; superconducting transition
                 temperature; temperature superconductors; Thallium
                 Compounds--Electric Conductivity; Three-Dimensional
                 Pairing; two-dimensional; upper critical fields; Upper
                 critical fields",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Dirty superconductors; Ginzburg--Landau theory;
                 High-temperature superconductors; Superconducting
                 critical field; Superconducting transition
                 temperature",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kataoka:1989:IHS,
  author =       "Mitsuo Kataoka",
  title =        "Instability and high-{T}$_c$ superconductivity",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "356--364",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The interrelation between instability and a high
                 superconducting transition temperature T$_c$ is argued
                 theoretically in order to construct a model for the
                 origin of the high T$_c$ in the perovskite-type oxides.
                 It is shown that when two nearly degenerate bands
                 overlapping on the Fermi energy in $_F$ become unstable
                 against spontaneous splitting to give rise to a charge
                 redistribution, effective interactions between two
                 electrons in the same bands become attractive, and the
                 attractive interactions are strongly enhanced by
                 increasing the degree of instability. One cause of this
                 instability is the electron-phonon coupling, which
                 results in lattice-instability-enhanced
                 superconductivity; another cause is the Coulomb
                 interaction between electrons, which results in
                 electron-instability-caused superconductivity. The
                 latter mechanism is successfully applied to the
                 perovskite-type high-T$_c$ superconductors. Some
                 guidelines for obtaining a high T$_c$ are presented on
                 the basis of the present idea.",
  acknowledgement = ack-nhfb,
  affiliation =  "Inst. for Mater. Res., Tohoko Univ.",
  affiliationaddress = "Sendai, Jpn",
  classcodes =   "A7420 (Theory); A7440 (Fluctuations and critical
                 effects); A7410 (Occurrence, critical temperature);
                 A7470V (Perovskite phase superconductors)",
  classification = "549; 701; 708; 804; 812; 932; 933; A7410
                 (Occurrence, critical temperature); A7420 (Theory);
                 A7440 (Fluctuations and critical effects); A7470V
                 (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Inst. for Mater. Res., Tohoko Univ., Sendai, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Alkali Metals--Electric Conductivity; Band Structure;
                 Ceramic Materials; Coulomb; Coulomb interaction;
                 Coulomb Interaction; Crystals; Degenerate bands;
                 Degenerate Bands; degenerate bands; design; Electron
                 Momentum Density; Electron-phonon coupling;
                 Electron-Phonon Coupling; electron-phonon coupling;
                 electron-phonon interactions; Fermi energy; Fermi
                 level; Fermi Surfaces; High temperature
                 superconductivity; high temperature superconductivity;
                 High Temperature Superconductors; high-temperature;
                 High-Temperature Superconductivity; Instability;
                 instability; interaction; measurement; Oxides; Particle
                 Beams; performance; Perovskite-type oxides;
                 Perovskite-Type Oxides; perovskite-type oxides;
                 Physical Properties; Positron Annihilation; Splitting;
                 splitting; Stability; Superconducting Materials;
                 Superconducting Materials--Physical Properties;
                 Superconducting Oxides; superconducting transition
                 temperature; Superconductivity; superconductors;
                 Transition temperature; transition temperature; Yttrium
                 Compounds--Electric Conductivity",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics \\ G.2.m Mathematics of Computing, DISCRETE
                 MATHEMATICS, Miscellaneous",
  thesaurus =    "Electron-phonon interactions; Fermi level;
                 High-temperature superconductors; Superconducting
                 transition temperature",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fossheim:1989:REP,
  author =       "Kristian Fossheim and Trygve Laegreid",
  title =        "A review of elastic properties of high-{T}$_c$
                 superconductors and some related {C}$_p$ results",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "365--371",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "First a brief survey is given of what can be learned
                 about important superconducting and normal-state
                 properties by ultrasonic and other elastic
                 measurements. Some of the characteristic elastic
                 properties of the La$_{2-x}$(Ba,Sr)$_x$CuO$_4$ and
                 YBa$_2$Cu$_3$O$_7$ systems are reviewed. In the
                 La-based family it is shown how the elastic
                 observations are closely related to structural and
                 soft-mode properties. The physics of YBa$_2$Cu/sub
                 3/O$_7$ is shown to be more complex. Finally, the
                 authors' recent results on the fluctuation contribution
                 to the specific heat near T$_c$ in YBa$_2$Cu/sub
                 3/O$_7$ are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Phys., Norwegian Inst. of Technol.",
  affiliationaddress = "Trondheim, Norw",
  chemicalindex = "LaBaSrCuO4/ss Ba/ss Cu/ss La/ss O4/ss Sr/ss O/ss;
                 YBa2Cu3O7/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O7/ss O/ss
                 Y/ss",
  classcodes =   "A7430G (Response to electromagnetic fields, nuclear
                 magnetic resonance, ultrasonic attenuation); A7430E
                 (Thermodynamic properties; thermal conductivity);
                 A7470V (Perovskite phase superconductors); A7440
                 (Fluctuations and critical effects)",
  classification = "641; 701; 708; 753; 812; 931; A7430E (Thermodynamic
                 properties; A7430G (Response to electromagnetic fields,
                 nuclear magnetic resonance, ultrasonic attenuation);
                 A7440 (Fluctuations and critical effects); A7470V
                 (Perovskite phase superconductors); thermal
                 conductivity)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Div. of Phys., Norwegian Inst. of Technol., Trondheim,
                 Norway",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3/O/sub 7/; Ceramic Materials; design, High
                 temperature superconductors; elastic constants; elastic
                 properties; Elastic properties; Elasticity;
                 experimentation; fluctuation; Fluctuation; fluctuations
                 in superconductors; high temperature superconductors;
                 High Temperature Superconductors; high-; La/sub
                 2-x/(BaSr)$_x$CuO$_4$; La/sub 2-x/(BaSr)$_x$CuO/sub 4/;
                 measurement; normal-state; Normal-state; Oxides;
                 performance; soft modes; soft-mode; Soft-mode; solids;
                 specific heat; Specific heat; Specific Heat; specific
                 heat of; structural properties; Structural properties;
                 Superconducting Materials; temperature superconductors;
                 Ultrasonic Effects--Measurements; Ultrasonic
                 measurements; ultrasonic measurements; ultrasonic
                 velocity; YBa$_2$Cu$_3$O$_7$; YBa$_2$Cu/sub; Yttrium
                 Barium Copper Oxide; Yttrium Compounds--Electric
                 Conductivity",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Elastic constants; Fluctuations in superconductors;
                 High-temperature superconductors; Soft modes; Specific
                 heat of solids; Ultrasonic velocity",
  treatment =    "G General Review",
}

@Article{Fink:1989:ESS,
  author =       "J. Fink and N. N{\"u}cker and H. A. Romberg and J. C.
                 Fuggle",
  title =        "Electronic structure studies of high-{T}$_c$
                 superconductors by high-energy spectroscopies",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "372--381",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "A review of our high-energy spectroscopy studies of
                 the electronic structure of the new high-T$_c$
                 superconductors is given. X-ray-induced photoelectron
                 spectroscopy, bremsstrahlung-isochromat spectroscopy,
                 Auger electron spectroscopy, and electron energy-loss
                 spectroscopy have been used. Parameters determining the
                 correlated electronic structure have been derived,
                 together with information on the nature and the
                 symmetry of the charge carriers.",
  acknowledgement = ack-nhfb,
  affiliation =  "Inst. fur Nukleare Festkorperphys.",
  affiliationaddress = "Carlsruhe, West Ger",
  classcodes =   "A7960 (Photoemission and photoelectron spectra);
                 A7145G (Exchange, correlation, dielectric and magnetic
                 functions, plasmons); A7470V (Perovskite phase
                 superconductors); A7920F (Electron impact: Auger
                 emission); A7125T (Band structure of crystalline
                 semiconductor compounds and insulators); A7870 (Other
                 interactions of matter with particles and radiation);
                 A7920K (Other electron impact phenomena)",
  classification = "701; 708; 801; A7125T (Band structure of crystalline
                 semiconductor compounds and insulators); A7145G
                 (Exchange, correlation, dielectric and magnetic
                 functions, plasmons); A7470V (Perovskite phase
                 superconductors); A7870 (Other interactions of matter
                 with particles and radiation); A7920F (Electron impact:
                 Auger emission); A7920K (Other electron impact
                 phenomena); A7960 (Photoemission and photoelectron
                 spectra)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Inst. fur Nukleare Festkorperphys., Karlsruhe, West
                 Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "and insulators; Auger effect; Auger electron; Auger
                 electron spectroscopy; band structure of crystalline
                 semiconductors; Bremsstrahlung-isochromat spectroscopy;
                 bremsstrahlung-isochromat spectroscopy;
                 Bremsstrahlung-Isochromat Spectroscopy; correlated;
                 Correlated electronic structure; design; electron
                 energy loss spectra; Electron energy-loss spectroscopy;
                 electron energy-loss spectroscopy; Electron Energy-Loss
                 Spectroscopy; electronic structure; experimentation;
                 high temperature superconductors; High Temperature
                 Superconductors; High temperature superconductors;
                 high-; high-energy; High-Energy Spectroscopies;
                 High-energy spectroscopies; inverse photoemission;
                 measurement; Oxides; Photoelectron Spectroscopy;
                 Spectroscopic Analysis; spectroscopies; spectroscopy;
                 Superconducting Materials; symmetry; Symmetry,
                 performance; temperature superconductors; X-ray induced
                 photoelectron spectroscopy; X-ray photoelectron
                 spectra",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics \\ F.2.2 Theory of Computation, ANALYSIS OF
                 ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
                 Algorithms and Problems, Geometrical problems and
                 computations",
  thesaurus =    "Auger effect; Band structure of crystalline
                 semiconductors and insulators; Electron energy loss
                 spectra; High-temperature superconductors; Inverse
                 photoemission spectroscopy; X-ray photoelectron
                 spectra",
  treatment =    "X Experimental",
}

@Article{Axe:1989:NSM,
  author =       "John D. Axe and David E. Cox and Kim Mohanty and H.
                 Moudden and Arnold Moodenbaugh and Youwen Xu and Thomas
                 R. Thurston",
  title =        "A new structural modification of superconducting
                 {La}$_{2-x}${M}$_x${CuO}$_4$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "382--388 (or 382--387??)",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "La$_{1.9}$Ba$_{0.1}$CuO$_4$ has been observed to
                 undergo the following sequence of transformations upon
                 cooling from 300 K: tetragonal (I4/mmm) to orthorhombic
                 (Cmca) to tetragonal (P4$_2$/ncm). The newly discovered
                 low-temperature tetragonal structure can be understood
                 geometrically as arising from a coherent superposition
                 of the two domain modifications of the orthorhombic
                 structure. Dynamically, it results from a second
                 instability in the twofold degenerate soft modes of the
                 high-temperature tetragonal phase. Energetically, the
                 system can be modeled as an XY-spin system with
                 temperature-dependent quartic anisotropy v(T), and the
                 low-temperature transformation coincides with an
                 isotropic point v(T$_1$)=0. The relationship of the
                 newly discovered transformation to other anomalous
                 properties and to superconductivity is discussed
                 briefly.",
  acknowledgement = ack-nhfb,
  affiliation =  "Brookhaven Nat. Lab.",
  affiliationaddress = "Upton, NY, USA",
  chemicalindex = "La1.9Ba0.1CuO4/ss Ba0.1/ss La1.9/ss Ba/ss Cu/ss La/ss
                 O4/ss O/ss",
  classcodes =   "A6470K (Solid-solid transitions); A7470V (Perovskite
                 phase superconductors)",
  classification = "701; 708; 804; 933; A6470K (Solid-solid
                 transitions); A7470V (Perovskite phase
                 superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Brookhaven Nat. Lab., Upton, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Anisotropy; anisotropy; barium compounds; Degenerate
                 Soft Modes; design; domain; Domain; Dynamics; dynamics;
                 experimentation; high temperature superconductor; High
                 temperature superconductor; High Temperature
                 Superconductors; high-temperature superconductors;
                 High-Temperature Tetragonal Phase; instability;
                 Instability; La$_{1.9}$Ba/sub 0.1/CuO$_4$, performance;
                 La/sub 1.9/Ba/sub 0.1/CuO/sub 4/; lanthanum compounds;
                 Lanthanum Compounds--Electric Conductivity;
                 Low-Temperature Tetragonal Structure; measurement;
                 orthorhombic; Orthorhombic Structure; Orthorhombic
                 structure; Oxides; Physical Properties; Quartic
                 Anisotropy; soft modes; Soft modes; solid-state phase;
                 structural transformations; Structural transformations;
                 structure; Superconducting Materials; tetragonal
                 structure; Tetragonal structure; transformations;
                 XY-spin system",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; High-temperature superconductors;
                 Lanthanum compounds; Soft modes; Solid-state phase
                 transformations",
  treatment =    "X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{vanKempen:1989:EDA,
  author =       "Herman {van Kempen} and Henk F. Hoevers and P. Jan M.
                 {van Bentum} and A. J. G. Schellingerhout and D. {van
                 der Marel}",
  title =        "Energy dependence of the {Andreev} reflection of
                 {YBa}$_2${Cu}$_5${O}$_{7-\delta}$",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "3",
  pages =        "389--393",
  month =        may,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "Measurements of the energy dependence of the Andreev
                 reflection have been performed on a Ag-YBa$_2$Cu/sub
                 3/O$_{7-\delta}$ interface. The observation of the
                 Andreev reflection indicates a ground state of
                 zero-momentum pairs. It is shown that, in principle,
                 the bulk Delta (electron pair potential) can be
                 determined from the energy dependence of the Andreev
                 reflection. In the present experiment, however, due to
                 the limited mean free path of the electrons in the
                 silver, only a lower limit of Delta was found.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Inst. for Mater.",
  affiliationaddress = "Nijmegen, Neth",
  chemicalindex = "Ag-YBa2Cu3O/int YBa2Cu3O/int Ba2/int Cu3/int Ag/int
                 Ba/int Cu/int O/int Y/int YBa2Cu3O/ss Ba2/ss Cu3/ss
                 Ba/ss Cu/ss O/ss Y/ss Ag/el",
  classcodes =   "A7450 (Proximity effects, tunnelling phenomena, and
                 Josephson effect); A7470V (Perovskite phase
                 superconductors)",
  classification = "701; 708; 804; 812; 933; A7450 (Proximity effects,
                 tunnelling phenomena, and Josephson effect); A7470V
                 (Perovskite phase superconductors)",
  conflocation = "Oberlech, Austria; 8-12 Aug. 1988",
  conftitle =    "IBM Europe Workshop on High-Temperature
                 Superconductivity",
  corpsource =   "Res. Inst. for Mater., Nijmegen Univ., Netherlands",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "3/O/sub 7- delta / interface;
                 Ag-YBa$_2$Cu$_3$O$_{7-\delta}$ interface; Ag-YBa/sub
                 2/Cu/sub; Andreev reflection; Andreev Reflection;
                 barium compounds; Ceramic Materials; compounds; design,
                 High temperature superconductor; Electron pair
                 potential; electron pair potential; experimentation;
                 high temperature superconductor; High Temperature
                 Superconductors; high-temperature superconductors; Mean
                 Free Path; measurement; momentum pairs; Oxides;
                 performance; Physical Properties; Superconducting
                 Materials; yttrium; Yttrium Barium Copper Oxide;
                 Yttrium Compounds--Electric Conductivity; zero-;
                 Zero-momentum pairs; Zero-Momentum Pairs",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Barium compounds; High-temperature superconductors;
                 Yttrium compounds",
  treatment =    "X Experimental",
}

@Article{Pareschi:1989:MIP,
  author =       "Maria Teresa Pareschi and Ralph Bernstein",
  title =        "Modeling and image processing for visualization of
                 volcanic mapping",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "406--416 (or 406--415??)",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "In countries where active volcanoes are located in
                 highly populated areas, the problem of risk reduction
                 is very important. Actual knowledge about volcanic
                 behavior does not allow deterministic event prediction
                 or the forecasting of eruptions. However, areas exposed
                 to eruptions can be analyzed if eruption
                 characteristics can be inferred or assumed. Models to
                 simulate volcanic eruptions and identify hazardous
                 areas have been developed by collaboration between the
                 IBM Italy Pisa Scientific Center and the Earth Science
                 Department of Pisa University The input to the models
                 is the set of assumed eruption characteristics: the
                 typology of the phenomenon (ash fall, pyroclastic flow,
                 etc.), vent position, total eruptible mass, wind
                 profile, etc. The output of the models shows volcanic
                 product distribution at ground level. These models are
                 reviewed and their use in hazard estimation (compared
                 with the more traditional techniques currently in use)
                 is outlined.",
  abstract-2 =   "Models to simulate volcanic eruptions and identify
                 hazardous areas have been developed by collaboration
                 between the IBM Italy Pisa Scientific Center and the
                 Earth Science Department of Pisa University (supported
                 by the Italian National Group of Volcanology of the
                 Italian National Research Council). The input to the
                 models is the set of assumed eruption characteristics:
                 the typology of the phenomenon (ash fall, pyroclastic
                 flow, etc.), vent position, total eruptible mass, wind
                 profile, etc. The output of the models shows volcanic
                 product distribution at ground level. These models are
                 reviewed and their use in hazard estimation (compared
                 with the more traditional techniques currently in use)
                 is outlined. Effective use of these models, by public
                 administrators and planners in preparing plans for the
                 evacuation of hazardous zones, requires the clear and
                 effective display of model results. Techniques to
                 display and visualize such data have been developed by
                 the authors. In particular, a computer program has been
                 implemented on the IBM 7350 Image Processing System to
                 display model outputs, representing both volume (in two
                 dimensions) and distribution of ejected material, and
                 to superimpose the displays upon satellite images that
                 show 3D oblique views of terrain.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Pisa Sci., Centre, Italy",
  classcodes =   "A9140 (Volcanology); C7340 (Geophysics); C5260B
                 (Computer vision and picture processing)",
  classification = "484; 723; 741; 751; A9140 (Volcanology); C5260B
                 (Computer vision and picture processing); C7340
                 (Geophysics)",
  corpsource =   "IBM Pisa Sci., Centre, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Acoustic Waves; Applications; Ash fall; ash fall;
                 Computer Graphics; Computer program; computer program;
                 computerised picture processing; design; eruptible
                 mass; evacuation; Evacuation; geophysics computing;
                 Hazard estimation; hazard estimation; Hazard Mapping;
                 hazardous areas; Hazardous areas; IBM 7350; IBM 7350
                 Image Processing System; IBM Italy Pisa Scientific
                 Center; Image Processing; image processing; Image
                 Processing System; Maps and Mapping; Pisa; Pisa
                 University; Pyroclastic flow; pyroclastic flow;
                 Satellite images; satellite images; Simulation Models;
                 theory, Image processing; total; Total eruptible mass;
                 University; Vent position; vent position; Volcanic
                 eruptions; Volcanic Eruptions; volcanic eruptions;
                 Volcanic mapping; volcanic mapping; Volcanic Mapping;
                 Volcanic product distribution; volcanic product
                 distribution; Volcanoes--Computer Simulation;
                 volcanology; wind profile; Wind profile",
  subject =      "J.2 Computer Applications, PHYSICAL SCIENCES AND
                 ENGINEERING, Earth and atmospheric sciences \\ I.2.10
                 Computing Methodologies, ARTIFICIAL INTELLIGENCE,
                 Vision and Scene Understanding, Modeling and recovery
                 of physical attributes \\ I.4.9 Computing
                 Methodologies, IMAGE PROCESSING, Applications",
  thesaurus =    "Computerised picture processing; Geophysics computing;
                 Volcanology",
  treatment =    "P Practical",
}

@Article{OConnor:1989:NQP,
  author =       "Michael A. O'Connor",
  title =        "Natural quadrics: {Projections} and intersections",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "417--446",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68U05 (51-04)",
  MRnumber =     "90g:68140",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "681.51016",
  abstract =     "Geometrical modelers usually strive to support at
                 least solids bounded by the results of Boolean
                 operations on planes, spheres, cylinders, and cones,
                 that is, the natural quadrics. Most often this set is
                 treated as a subset of the set of quadric surfaces.
                 Although the intersection of two quadrics is a
                 mathematically tractable problem, in implementation it
                 leads to complexity and stability problems. Even in the
                 restriction to the natural quadrics these problems can
                 persist. This paper presents a method which, by using
                 the projections of natural quadrics onto planes and
                 spheres, reduces the intersection of two natural
                 quadrics to the calculation of the intersections of
                 lines and circles on planes and spheres. In order to
                 make the claims of the method easily verifiable and
                 provide the tools necessary for implementation,
                 explicit descriptions of the projections are also
                 included.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Centre",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "C4290 (Other computer theory)",
  classification = "921; 931; C4290 (Other computer theory)",
  corpsource =   "IBM Thomas J. Watson Res. Centre, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Boolean operations; Complexity; complexity;
                 computational geometry; cones; Cones; Cylinder/Cone
                 Intersection; Cylinders; cylinders;
                 Cylinders--Mathematical Models; design; Domain
                 Segmentation; Explicit descriptions; explicit
                 descriptions; Levin's Method; Mathematical Models;
                 Mathematical Techniques--Geometry; Mathematically
                 tractable problem; mathematically tractable problem;
                 Natural quadrics; Natural Quadrics; natural quadrics;
                 Planar Projections; Planes; planes; Quadrics
                 Intersections; solid modelling; Spheres; spheres;
                 stability; Stability; theory; verification, Boolean
                 operations",
  subject =      "I.3.5 Computing Methodologies, COMPUTER GRAPHICS,
                 Computational Geometry and Object Modeling, Curve,
                 surface, solid, and object representations \\ G.2.m
                 Mathematics of Computing, DISCRETE MATHEMATICS,
                 Miscellaneous \\ F.2.2 Theory of Computation, ANALYSIS
                 OF ALGORITHMS AND PROBLEM COMPLEXITY, Nonnumerical
                 Algorithms and Problems, Geometrical problems and
                 computations",
  thesaurus =    "Computational geometry; Solid modelling",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Tang:1989:FLS,
  author =       "C. L. Tang and F. W. Wise and M. J. Rosker and I. A.
                 Walmsley",
  title =        "Femtosecond laser studies of the relaxation dynamics
                 of semiconductors and large molecules",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "447--455",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The use of femtosecond lasers and the related optical
                 correlation spectroscopic technique for studying the
                 relaxation dynamics of semiconductors and photoexcited
                 molecules are reviewed. In particular, the results on
                 the intraband relaxation of nonequilibrium carriers in
                 GaAs and related compounds and quantum well structures
                 are summarized. The optical correlation technique also
                 led to the observation of quantum beats in the
                 femtosecond time domain corresponding to the direct
                 observation of molecular vibrations in the time
                 domain.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. Eng., Cornell Univ., Ithaca, NY,
                 USA",
  chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
  classcodes =   "A7847 (Time-resolved optical spectroscopies and other
                 ultrafast optical measurements in condensed matter);
                 A7865J (Nonmetals); A3380 (Photon interactions with
                 molecules)",
  classification = "714; 744; 801; 931; A3380 (Photon interactions with
                 molecules); A7847 (Time-resolved optical spectroscopies
                 and other ultrafast optical measurements in condensed
                 matter); A7865J (Nonmetals)",
  corpsource =   "Dept. of Electr. Eng., Cornell Univ., Ithaca, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "carrier relaxation time; design; experimentation;
                 Femtosecond Laser Studies; femtosecond lasers;
                 Femtosecond lasers; GaAs; gallium arsenide; III-V;
                 intraband relaxation; Intraband relaxation;
                 Lasers--Applications; measurement; measurement by laser
                 beam; molecular; molecules; Molecules; Nonequilibrium
                 Carriers; optical correlation; Optical correlation
                 spectroscopic technique; Optical Correlation
                 Spectroscopic Techniques; performance; photoexcitation;
                 photoexcited; Photoexcited molecules; Photoexcited
                 Molecules; photon correlation spectroscopy; quantum
                 beats; Quantum beats; quantum well structures; Quantum
                 well structures; Quantum Well Structures; relaxation
                 dynamics; Relaxation Dynamics; Semiconducting Gallium
                 Arsenide--Charge Carriers; Semiconductor Materials;
                 semiconductor quantum wells; semiconductors;
                 Semiconductors; Spectroscopic Analysis; spectroscopic
                 technique; theory, Relaxation dynamics",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Carrier relaxation time; Gallium arsenide; III-V
                 semiconductors; Measurement by laser beam; Molecular
                 photoexcitation; Photon correlation spectroscopy;
                 Semiconductor quantum wells",
  treatment =    "X Experimental",
}

@Article{He:1989:EQP,
  author =       "Shanjin He and Julian D. Maynard",
  title =        "Effects of quasiperiodic ({Penrose} tile) symmetry on
                 the eigenvalues and eigenfunctions of the wave
                 equation",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "456--463",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The use of femtosecond lasers and the related optical
                 correlation spectroscopic technique for studying the
                 relaxation dynamics of semiconductors and photoexcited
                 molecules are reviewed. In particular, the results on
                 the intraband relaxation of nonequilibrium carriers in
                 GaAs and related compounds and quantum well structures
                 are summarized. The optical correlation technique also
                 led to the observation of quantum beats in the
                 femtosecond time domain corresponding to the direct
                 observation of molecular vibrations in the time
                 domain.",
  abstract-2 =   "In addition to the basic crystalline and amorphous
                 structures for solids, it is possible that solids may
                 also form with a quasiperiodic, or Penrose tile,
                 structure. A current problem in condensed-matter
                 physics is to determine how this structure affects the
                 various physical properties of a material. A
                 fundamental question involves the consequences of
                 quasiperiodic symmetry in the eigenvalue spectrum and
                 eigenfunctions of a wave equation. While rigorous
                 theorems have been derived for one-dimensional systems,
                 there is currently no known `quasi-Bloch theorem' for
                 two and three dimensions. To gain insight into this
                 problem, an acoustic experiment has been used to study
                 a two-dimensional wave system with a Penrose tile
                 symmetry. The results show an eigenvalue spectrum
                 containing bands and gaps with widths which are in the
                 ratio of the Golden Mean, ($\sqrt{5} + 1/2$).",
  acknowledgement = ack-nhfb,
  affiliation =  "University Park",
  affiliationaddress = "University Park, PA, USA",
  classcodes =   "A6265 (Acoustic properties of solids); A6150E (Crystal
                 symmetry; models and space groups, and crystalline
                 systems and classes)",
  classification = "714; 744; 801; 921; 931; 933; A6150E (Crystal
                 symmetry; A6265 (Acoustic properties of solids); models
                 and space groups, and crystalline systems and
                 classes)",
  corpsource =   "Dept. of Phys., Pennsylvania State Univ., University
                 Park, PA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Acoustic experiment; acoustic experiment; acoustic
                 wave propagation; Condensed Matter Physics;
                 Condensed-matter physics; condensed-matter physics;
                 crystal symmetry; design; Eigenfunctions;
                 eigenfunctions; Eigenvalues; eigenvalues; eigenvalues
                 and; Femtosecond Laser Studies; Golden; Golden Mean;
                 Lasers--Applications; Mathematical
                 Techniques--Eigenvalues and Eigenfunctions; Mean;
                 measurement; Molecules; Nonequilibrium Carriers;
                 Optical Correlation Spectroscopic Techniques; Penrose
                 tile; Penrose Tile Symmetry; performance; Photoexcited
                 Molecules; Physics; Quantum Well Structures;
                 Quasi-Bloch theorem; quasi-Bloch theorem;
                 quasicrystals; Quasiperiodic; quasiperiodic;
                 Quasiperiodic Symmetry; Relaxation Dynamics;
                 Semiconducting Gallium Arsenide--Charge Carriers;
                 Semiconductor Materials; Solid State; Solids;
                 Spectroscopic Analysis; theory; Two Dimensional Wave
                 System; Two-dimensional wave system; two-dimensional
                 wave system; Wave Equation; Wave equation; wave
                 equation",
  subject =      "G.1.3 Mathematics of Computing, NUMERICAL ANALYSIS,
                 Numerical Linear Algebra, Eigenvalues \\ G.1.m
                 Mathematics of Computing, NUMERICAL ANALYSIS,
                 Miscellaneous \\ J.2 Computer Applications, PHYSICAL
                 SCIENCES AND ENGINEERING, Physics",
  thesaurus =    "Acoustic wave propagation; Crystal symmetry;
                 Eigenvalues and eigenfunctions; Quasicrystals",
  treatment =    "X Experimental",
}

@Article{Yetzer:1989:TSM,
  author =       "Roger H. Yetzer",
  title =        "Time series in {M} dimensions: The power spectrum",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "464--469",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  abstract =     "The approach presented here extends the modeling of
                 M-dimensional (spatial) time series from the time
                 domain into the frequency domain. The autocovariance
                 function for an M-dimensional time series is
                 transformed to obtain the power spectrum in M
                 dimensions. The latter describes the variance within
                 the series and can be used to identify dependencies
                 and\slash or test the adequacy of a fitted model. An
                 example is provided.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp.",
  affiliationaddress = "Kingston, NY, USA",
  classcodes =   "B0240Z (Other and miscellaneous); C1140Z (Other and
                 miscellaneous)",
  classification = "921; 922; B0240Z (Other and miscellaneous); C1140Z
                 (Other and miscellaneous)",
  corpsource =   "IBM Corp., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Autocovariance Function; Autocovariance function;
                 autocovariance function; design; domain; fitted; Fitted
                 model; frequency domain; Frequency domain; Frequency
                 Domain; M Dimensional Power Spectrum; M Dimensional
                 Time Series; M-dimensional; Mathematical
                 Transformations; measurement; model; Modeling;
                 modeling; performance; power spectrum; Power Spectrum
                 Estimation; series (mathematics); Spatial Time Series;
                 Spectrum Analysis; Statistical Methods; stochastic
                 processes; theory, Power spectrum; time; Time domain;
                 Time series; time series; Time Series Analysis",
  subject =      "G.3 Mathematics of Computing, PROBABILITY AND
                 STATISTICS, Statistical computing",
  thesaurus =    "Series [mathematics]; Stochastic processes",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Patel:1989:TLC,
  author =       "Arvind M. Patel",
  title =        "Two-level coding for error control in magnetic disk
                 storage products",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "4",
  pages =        "470--484",
  month =        jul,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "Compendex database;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  ZMnumber =     "709.94653",
  abstract =     "Error-control coding has played a significant role in
                 the design and development of magnetic recording
                 storage products. The trend toward higher densities and
                 data rates presents continuing demands for an ability
                 to operate at a lower signal-to-noise ratio and to
                 tolerate an increased number of correctable errors.
                 Heretofore, the magnetic disk storage products used
                 coding schemes that provided correction of one burst of
                 errors in a record of length ranging from a few bytes
                 of data to a full track on the disk. In this paper, the
                 author presents a new coding architecture that
                 facilitates correction of multiple-burst errors in each
                 record in a typical disk storage application. This
                 architecture embodies a two-level coding scheme which
                 offers high coding efficiency along with a fast
                 decoding strategy that closely matches the requirements
                 of on-line correction of multiple bursts of errors. The
                 first level has a smaller block delay and provides very
                 fast correction of most of the errors commonly
                 encountered in an average disk file. The second level,
                 on a larger block size, provides reserve capability for
                 correcting additional errors.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Products Div.",
  affiliationaddress = "San Jose, CA, USA",
  classcodes =   "B3120B (Magnetic recording); B6120B (Codes); C5320C
                 (Storage on moving magnetic media)",
  classification = "722; 723; 921; B3120B (Magnetic recording); B6120B
                 (Codes); C5320C (Storage on moving magnetic media)",
  corpsource =   "IBM Gen. Products Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Applications; Codes, Symbolic; coding; Coding
                 architecture; coding architecture; Coding Architecture;
                 Coding efficiency; Coding schemes; coding schemes; data
                 rates; Data rates; Data Storage, Magnetic--Disk;
                 Decoding strategy; decoding strategy; design;
                 efficiency; encoding; error control; Error Control
                 Coding; error correction codes; Error Rate Performance;
                 magnetic disc storage; Magnetic disk storage products;
                 Magnetic Disk Storage Products; magnetic disk storage
                 products; measurement; Multiple Burst Errors;
                 multiple-burst errors; Multiple-burst errors;
                 performance; Signal-to-noise ratio; signal-to-noise
                 ratio; storage management; theory; Two-Level Coding;
                 two-level coding scheme; Two-level coding scheme;
                 verification, Error control",
  subject =      "B.3.2 Hardware, MEMORY STRUCTURES, Design Styles \\
                 B.3.4 Hardware, MEMORY STRUCTURES, Reliability,
                 Testing, and Fault-Tolerance \\ C.4 Computer Systems
                 Organization, PERFORMANCE OF SYSTEMS, Performance
                 attributes \\ E.4 Data, CODING AND INFORMATION THEORY",
  thesaurus =    "Encoding; Error correction codes; Magnetic disc
                 storage; Storage management",
  treatment =    "P Practical",
}

@Article{Alfonseca:1989:FSN,
  author =       "M. Alfonseca",
  title =        "Frames, semantic networks, and object-oriented
                 programming in {APL2}",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "5",
  pages =        "502--510",
  month =        sep,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Discusses the capabilities of APL2 for the
                 implementation of frame systems and semantic networks,
                 and for the use of object-oriented programming
                 techniques. The fact that the frame is a basic data
                 structure of APL2 makes this language very appropriate
                 for the development of artificial intelligence
                 applications using the indicated techniques. Examples
                 are given of the way in which they may be applied to
                 realistic situations.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6140D (High level languages); C6110 (Systems analysis
                 and programming); C6120 (File organisation)",
  classification = "C6110 (Systems analysis and programming); C6120
                 (File organisation); C6140D (High level languages)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; APL2; applications; artificial intelligence;
                 Artificial intelligence applications; data structure;
                 Data structure; data structures; design; frame; Frame
                 systems; languages; object-; object-oriented
                 programming; Object-oriented programming; oriented
                 programming; semantic networks; systems; theory,
                 Semantic networks",
  subject =      "D.3.2 Software, PROGRAMMING LANGUAGES, Language
                 Classifications, APL \\ D.1.m Software, PROGRAMMING
                 TECHNIQUES, Miscellaneous \\ D.3.3 Software,
                 PROGRAMMING LANGUAGES, Language Constructs, Data types
                 and structures",
  thesaurus =    "APL; Artificial intelligence; Data structures;
                 Object-oriented programming",
  treatment =    "P Practical",
}

@Article{Smith:1989:DEC,
  author =       "W. E. Smith and K. S. Trivedi",
  title =        "Dependability evaluation of a class of multi-loop
                 topologies for local area networks",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "5",
  pages =        "511--523",
  month =        sep,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Local area networks have been developed using both
                 ring and bus topologies. Multi-loop and multi-connected
                 topologies have been proposed to improve the throughput
                 and dependability of single-loop networks. The authors
                 evaluate the dependability of a class of
                 multi-connected loop topologies called forward loop,
                 backward hop (FLBH) networks and compare them to simple
                 ring networks.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210L (Computer communications); C5620L (Local area
                 networks)",
  classification = "B6210L (Computer communications); C5620L (Local area
                 networks)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "backward hop; Backward hop; bus topologies; Bus
                 topologies; dependability; Dependability; design;
                 forward loop; Forward loop; local area networks; Local
                 area networks; measurement; multi-connected topologies;
                 Multi-connected topologies; multi-loop topologies;
                 network topology; performance; reliability; ring
                 networks; Ring networks; theory; throughput;
                 Throughput; verification, Multi-loop topologies",
  subject =      "C.2.5 Computer Systems Organization,
                 COMPUTER-COMMUNICATION NETWORKS, Local Networks \\ C.4
                 Computer Systems Organization, PERFORMANCE OF SYSTEMS
                 \\ F.1.2 Theory of Computation, COMPUTATION BY ABSTRACT
                 DEVICES, Modes of Computation, Probabilistic
                 computation",
  thesaurus =    "Local area networks; Network topology",
  treatment =    "P Practical",
}

@Article{Matick:1989:ADO,
  author =       "R. Matick and R. Mao and S. Ray",
  title =        "Architecture, design, and operating characteristics of
                 a 12-ns {CMOS} functional cache chip",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "5",
  pages =        "524--539",
  month =        sep,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This cache chip incorporates a number of unique
                 on-chip functions as well as unique design, providing a
                 one-cycle cache in which translation can be overlapped
                 with cache access. In order to achieve high average
                 performance, a cache should give the appearance of
                 being a two-ported array in order to provide high
                 bandwidth both to the processor during normal execution
                 and to the main memory during reload. But a true
                 two-port design is undesirable as well as unnecessary,
                 especially since the reload process is typically
                 limited by the memory speed and other system
                 parameters. A significant improvement can be obtained
                 by judicious choice as well as proper integration of
                 some critical functions placed directly on the cache
                 chips. This paper describes these functions and
                 integration onto a 72 K-bit static RAM chip,
                 implemented in 1-$\mu$m CMOS technology for high speed
                 and overall system performance. In addition, the chip
                 I/O is selectable for either ECL or TTL
                 compatibility.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage)",
  classification = "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1 micron; 1 Micron; 12 ns; 12 Ns; 72 kbit; 72 Kbit;
                 bandwidth; Bandwidth; buffer storage; cache access;
                 Cache access; chip I/O; Chip I/O; circuits; CMOS; CMOS
                 functional cache chip; CMOS integrated circuits;
                 critical functions; Critical functions; design; ECL
                 compatibility; functional cache chip; integrated
                 memory; measurement; memory speed; Memory speed;
                 on-chip functions; On-chip functions; one-cycle cache;
                 One-cycle cache; operating characteristics; Operating
                 characteristics; performance; random-access storage;
                 reload process; Reload process; static RAM chip; Static
                 RAM chip; theory, ECL compatibility; TTL compatibility;
                 two-ported array; Two-ported array",
  numericalindex = "Time 1.2E-08 s; Storage capacity 7.4E+04 bit; Size
                 1.0E-06 m",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Memory technologies \\ B.3.2 Hardware, MEMORY
                 STRUCTURES, Design Styles, Cache memories \\ C.4
                 Computer Systems Organization, PERFORMANCE OF SYSTEMS",
  thesaurus =    "Buffer storage; CMOS integrated circuits; Integrated
                 memory circuits; Random-access storage",
  treatment =    "P Practical; X Experimental",
}

@Article{vandenBerg:1989:ODS,
  author =       "H. A. M. {van den Berg}",
  title =        "Order in the domain structure in soft-magnetic
                 thin-film elements: a review",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "5",
  pages =        "540--582",
  month =        sep,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The domain structure and its development in thin
                 plane-parallel soft-magnetic elements have been
                 investigated from both the experimental and the
                 theoretical point of view. The experimental
                 observations for verifying the predictions have been
                 realized by means of the Bitter, Kerr, and Lorentz
                 techniques. In the first part, a self-consistent domain
                 theory, based on micromagnetic principles, is unfolded
                 for two-dimensional solenoidal magnetization
                 distributions present in ideally soft-magnetic
                 thin-film objects that are rectangular cylinders. The
                 solenoidality implies that both the external field and
                 the conduction currents are taken as zero. Two types of
                 domain structures are distinguished: the basic
                 structures in simply connected regions and the parallel
                 configurations in special types of multiply connected
                 regions-the parallel regions. A number of experimental
                 examples are provided. In the second part, the M
                 distribution is studied.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7570K (Domain structure (magnetic bubbles)); A7560C
                 (Domain walls and domain structure); A0130R (Reviews
                 and tutorial papers; resource letters); B3110C
                 (Ferromagnetic materials); B3120N (Magnetic thin film
                 devices)",
  classification = "A0130R (Reviews and tutorial papers; A7560C (Domain
                 walls and domain structure); A7570K (Domain structure
                 (magnetic bubbles)); B3110C (Ferromagnetic materials);
                 B3120N (Magnetic thin film devices); resource
                 letters)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bitter technique; conduction currents; Conduction
                 currents; design; devices; domain structure; Domain
                 structure; elements; experimentation; external;
                 External field; ferromagnetism; field; Kerr techniques;
                 Lorentz techniques; M distribution; magnetic domains;
                 magnetic thin film; magnetic thin films; magnetic
                 thin-film elements; magnetisation; magnetization
                 distributions; measurement; micromagnetic principles;
                 Micromagnetic principles; multiply connected regions;
                 Multiply connected regions; parallel configurations;
                 Parallel configurations; performance; plane-parallel
                 soft-magnetic; Plane-parallel soft-magnetic elements;
                 rectangular cylinders; Rectangular cylinders; reviews;
                 self-consistent domain theory; Self-consistent domain
                 theory; soft-; Soft-magnetic thin-film elements;
                 theory, Kerr techniques; two-dimensional solenoidal;
                 Two-dimensional solenoidal magnetization
                 distributions",
  subject =      "B.7.1 Hardware, INTEGRATED CIRCUITS, Types and Design
                 Styles, Advanced technologies \\ G.m Mathematics of
                 Computing, MISCELLANEOUS \\ F.1.2 Theory of
                 Computation, COMPUTATION BY ABSTRACT DEVICES, Modes of
                 Computation, Probabilistic computation \\ A.1 General
                 Literature, INTRODUCTORY AND SURVEY \\ J.2 Computer
                 Applications, PHYSICAL SCIENCES AND ENGINEERING,
                 Physics",
  thesaurus =    "Ferromagnetism; Magnetic domains; Magnetic thin film
                 devices; Magnetic thin films; Magnetisation; Reviews",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Franaszek:1989:CCC,
  author =       "P. A. Franaszek",
  title =        "Coding for constrained channels: a comparison of two
                 approaches",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "6",
  pages =        "602--608",
  month =        nov,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Discusses the relation between some early techniques
                 for constrained channel coding and more recent ones
                 adapted from the mathematical area of symbolic
                 dynamics. A primary difference between the two is that
                 the latter focus on issues of code existence whereas
                 the former were primarily concerned with code
                 construction and optimality.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B6110 (Information theory); B6120B (Codes); C1260
                 (Information theory)",
  classification = "B6110 (Information theory); B6120B (Codes); C1260
                 (Information theory)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "code construction; Code construction; code existence;
                 Code existence; constrained channels; Constrained
                 channels; encoding; information theory; optimality;
                 Optimality; symbolic dynamics; Symbolic dynamics;
                 telecommunication channels",
  thesaurus =    "Encoding; Information theory; Telecommunication
                 channels",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Zable:1989:MPA,
  author =       "J. L. Zable and E. F. Helinski",
  title =        "Matrix print actuator for dot band printer",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "6",
  pages =        "609--617",
  month =        nov,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The design selection of an impact matrix print
                 actuator is described, along with its method of design
                 and optimization. The dot band printer concept is
                 discussed in conjunction with operational requirements
                 for the hammer; these requirements, and methods of
                 meeting them, are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Endicott, NY, USA",
  classcodes =   "C5550 (Printers, plotters and other hard-copy output
                 devices)C3260B (Electric equipment)",
  classification = "C3260B (Electric equipment); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Data Syst. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "actuator; design selection; Design selection; dot band
                 printer; Dot band printer; electric actuators; hammer;
                 Hammer; impact matrix print; Impact matrix print
                 actuator; matrix printers; optimization; Optimization",
  thesaurus =    "Electric actuators; Matrix printers",
  treatment =    "A Application; P Practical",
}

@Article{Irvin:1989:PIC,
  author =       "D. R. Irvin",
  title =        "Preserving the integrity of cyclic-redundancy checks
                 when protected text is intentionally altered",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "6",
  pages =        "618--626",
  month =        nov,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "As a digitally encoded message traverses a series of
                 point-to-point communication links, it may be necessary
                 to change the contents of that message at an
                 intermediate station. If bit errors are introduced by
                 the intermediary while the text is unprotected, these
                 errors will be subsequently undetectable by cyclic
                 redundancy checks. An algorithm is presented here for
                 ensuring that such errors will not go undetected. Since
                 the cyclic redundancy check is based on a linear
                 mathematical operation, the frame-check sequence may be
                 modified, rather than recalculated, by each
                 intermediary changing the protected text. A frame-check
                 sequence constructed in this way will reveal any errors
                 introduced in the transmission path when the message is
                 finally examined at the ultimate destination. Examples
                 of the proposed technique applied to various local-area
                 network bridges are developed. The technique is shown
                 to be beneficial in these examples when the internal
                 bit-error ratio of the text-changing device exceeds
                 10/sup -19/ on unprotected paths.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Commun. Syst., US Telecommun. Center, Research
                 Triangle Park, NC, USA",
  classcodes =   "B6210L (Computer communications); B6120B (Codes);
                 C5620L (Local area networks)",
  classification = "B6120B (Codes); B6210L (Computer communications);
                 C5620L (Local area networks)",
  corpsource =   "IBM Commun. Syst., US Telecommun. Center, Research
                 Triangle Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bit errors; Bit errors; cyclic-redundancy checks;
                 Cyclic-redundancy checks; digitally encoded; Digitally
                 encoded message; error detection codes; frame-check;
                 Frame-check sequence; intermediary; Intermediary;
                 internal bit-error; Internal bit-error ratio; linear
                 mathematical operation; Linear mathematical operation;
                 local area networks; local-area network bridges;
                 Local-area network bridges; message; point-to-point
                 communication links; Point-to-point communication
                 links; protected text; Protected text; ratio; sequence;
                 switching; text-changing device; Text-changing device",
  thesaurus =    "Error detection codes; Local area networks; Message
                 switching",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Fordyce:1989:RKF,
  author =       "K. Fordyce and J. Jantzen and G. A. {Sullivan, Sr.}
                 and G. A. {Sullivan, Jr.}",
  title =        "Representing knowledge with functions and {Boolean}
                 arrays",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "6",
  pages =        "627--646",
  month =        nov,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Over the past eighteen years a variety of advanced
                 decision support systems have been built with
                 knowledge-based expert system (KBES) components. For
                 the past eight years, a knowledge representation and
                 manipulation (KRM) scheme called FABA (Functions And
                 Boolean Arrays) has been used. It has two basic
                 principles. First, knowledge is viewed as a functional
                 mapping between input and output variables, where the
                 functions are expressed as fact tables or bases and
                 procedure modules. Second, the function network can be
                 represented with Boolean arrays. The basics of FABA,
                 its implementation in APL2, and a simple example of
                 FABA's application in a manufacturing dispatch
                 application for IBM's semiconductor facility in
                 Burlington, Vermont, are described in this paper.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Eng./Sci. Comput. Center,
                 Kingston, NY, USA",
  classcodes =   "C7160 (Manufacturing and industry); C7102 (Decision
                 support systems); C6170 (Expert systems)",
  classification = "C6170 (Expert systems); C7102 (Decision support
                 systems); C7160 (Manufacturing and industry)",
  corpsource =   "IBM Data Syst. Div., Eng./Sci. Comput. Center,
                 Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; APL2; arrays; bases; Bases; Boolean; Boolean
                 arrays; Boolean functions; decision support systems;
                 Decision support systems; dispatching; expert systems;
                 FABA; fact tables; Fact tables; functional; Functional
                 mapping; knowledge engineering; knowledge
                 representation and manipulation; Knowledge
                 representation and manipulation; knowledge-based expert
                 system; Knowledge-based expert system; manufacturing
                 dispatch application; Manufacturing dispatch
                 application; mapping; procedure modules; Procedure
                 modules; semiconductor facility; Semiconductor
                 facility",
  thesaurus =    "APL; Boolean functions; Decision support systems;
                 Dispatching; Expert systems; Knowledge engineering",
  treatment =    "A Application; P Practical",
}

@Article{Stapper:1989:FPI,
  author =       "C. H. Stapper",
  title =        "Fault-simulation programs for integrated-circuit yield
                 estimations",
  journal =      j-IBM-JRD,
  volume =       "33",
  number =       "6",
  pages =        "647--652",
  month =        nov,
  year =         "1989",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Three programs are described here which have been used
                 for integrated-circuit yield modeling at the IBM
                 facility in Essex Junction, Vermont. The first program
                 generates negative binomial distributions which are
                 used to represent the frequency distribution of the
                 number of faults per chip. Calculations with the
                 generalized combination function A ! B in APL are
                 limited to simulations of up to 99999 faults, and can
                 take too much computer time to run. These limitations
                 are eliminated when the calculations make use of the
                 scan function. The second program simulates clustered
                 fault locations on a map. The clusters are initially
                 generated using a radial Gaussian probability
                 distribution. Each fault location is stored as a
                 complex number, which facilitates the use of
                 cluster-shaping programs that are also described. In a
                 third program, another simulator of fault maps faults
                 are added as a function of time. This program also
                 results in fault distributions that are clustered. In
                 addition, it produces frequency distributions that very
                 closely approximate negative binomial distributions.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B1265 (Digital electronics); B1130B (Computer-aided
                 circuit analysis and design); C7410D (Electronic
                 engineering)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B1265 (Digital electronics); C7410D (Electronic
                 engineering)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; APL listings; binomial distributions;
                 cluster-shaping programs; Cluster-shaping programs;
                 clustered fault locations; Clustered fault locations;
                 digital; digital integrated circuits; distribution;
                 distributions; electronic engineering computing; fault;
                 Fault distributions; fault location; fault maps; Fault
                 maps; faults; Faults; frequency distribution; Frequency
                 distribution; generalized combination function;
                 Generalized combination function; IBM facility;
                 integrated-circuit yield estimations;
                 Integrated-circuit yield estimations; negative;
                 Negative binomial distributions; radial Gaussian
                 probability; Radial Gaussian probability distribution;
                 scan function; Scan function; simulation",
  thesaurus =    "APL listings; Digital integrated circuits; Digital
                 simulation; Electronic engineering computing; Fault
                 location",
  treatment =    "A Application; P Practical",
}

@Article{Donofrio:1990:P,
  author =       "N. M. Donofrio",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "2--3",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:42:18 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: ``The IBM RISC System\slash 6000
                 processor''.",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401B.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cocke:1990:ERT,
  author =       "John Cocke and Victoria Markstein",
  title =        "The evolution of {RISC} technology at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "4--11",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401C.pdf",
  abstract =     "The paper traces the evolution of IBM RISC
                 architecture from its origins in the 1970s at the IBM
                 Thomas J Watson Research Center to the present-day IBM
                 RISC System/6000 computer. The acronym RISC (reduced
                 instruction-set computer) is used to describe the 801
                 and subsequent architectures. However, RISC in this
                 context does not strictly imply a reduced number of
                 instructions, but rather a set of primitives carefully
                 chosen to exploit the fastest component of the storage
                 hierarchy and provide instructions that can be
                 generated easily by compilers. The paper describes how
                 these goals were embodied in the 801 architecture and
                 how they have since evolved on the basis of experience
                 and new technologies. The effect of this evolution is
                 illustrated with the results of several benchmark tests
                 of CPU performance.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C5220 (Computer architecture)",
  classification = "C5220 (Computer architecture)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1970S; 1970s; 801 Architecture; 801 architecture;
                 Benchmark tests; benchmark tests; Center; Compilers;
                 compilers; CPU; CPU performance; Fastest component;
                 fastest component; IBM computers; IBM RISC
                 architecture; IBM RISC System/6000 computer; IBM Thomas
                 J Watson Research; IBM Thomas J Watson Research Center;
                 performance; reduced instruction set computing; reduced
                 instruction-; Reduced instruction-set computer; set
                 computer; storage hierarchy; Storage hierarchy",
  thesaurus =    "IBM computers; Reduced instruction set computing",
  treatment =    "G General Review; P Practical",
}

@Article{Bakoglu:1990:IRS,
  author =       "H. B. Bakoglu and G. F. Grohoski and R. K. Montoye",
  title =        "The {IBM RISC System}\slash 6000 processor: Hardware
                 overview",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "12--22",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401D.pdf",
  abstract =     "A highly concurrent superscalar second-generation
                 family of RISC workstations and servers is described.
                 The RISC System\slash 6000 family is based on the new
                 IBM POWER (performance optimization with enhanced RISC)
                 architecture; the hardware implementation takes
                 advantage of this powerful RISC architecture and
                 employs sophisticated design techniques to achieve a
                 short cycle time and a low cycles-per-instruction (CPI)
                 ratio. The RS\slash 6000 CPU features
                 multiple-instruction dispatch, multiple functional
                 units that operate concurrently, separate instruction
                 and data caches, and zero-cycle branches. In this
                 superscalar implementation, at a given cycle the
                 equivalent of five operations can be executed
                 simultaneously (a branch, a condition-register
                 operation, and a floating-point multiply-add). The
                 RS\slash 6000 family supports the IBM Micro Channel
                 architecture as well as high-speed serial optical links
                 to provide a high-bandwidth I/O subsystem.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Adv. Workstations Div., Austin, TX, USA",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C5220
                 (Computer architecture)",
  classification = "C5220 (Computer architecture); C5440 (Multiprocessor
                 systems and techniques)",
  corpsource =   "IBM Adv. Workstations Div., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architecture; branch; Branch; caches; concurrent
                 superscalar second-generation family; Concurrent
                 superscalar second-generation family;
                 condition-register; Condition-register operation; CPI
                 ratio; Cycle time; cycle time; cycles-per-instruction;
                 Cycles-per-instruction ratio; data; Data caches;
                 floating-point multiply-add; Floating-point
                 multiply-add; high-bandwidth I/O; High-bandwidth I/O
                 subsystem; High-bandwidth I/O subsystem, RISC servers;
                 IBM computers; IBM Micro Channel; IBM Micro Channel
                 architecture; IBM POWER architecture; IBM RISC
                 System/6000; IBM RISC System/6000 processor; IBM RISC
                 System\slash 6000 processor; instruction caches;
                 Instruction caches; instruction dispatch; Multiple
                 functional units; multiple functional units; multiple-;
                 Multiple-instruction dispatch; multiprocessing systems;
                 operation; performance optimization with enhanced;
                 Performance optimization with enhanced RISC; processor;
                 ratio; reduced instruction; RISC; RISC architecture;
                 RISC servers; RISC workstations; RS/6000 CPU; RS\slash
                 6000 CPU; serial optical links; Serial optical links;
                 set computing; subsystem; zero-cycle branches;
                 Zero-cycle branches",
  thesaurus =    "IBM computers; Multiprocessing systems; Reduced
                 instruction set computing",
  treatment =    "P Practical",
}

@Article{Oehler:1990:IRS,
  author =       "R. R. Oehler and R. D. Groves",
  title =        "{IBM RISC System}\slash 6000 processor architecture",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "23--36",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401E.pdf",
  abstract =     "Describes the hardware architecture of the IBM RISC
                 System\slash 6000 processor, which combines basic RISC
                 principles with a partitioning of registers by function
                 into multiple ALUs. This allows a high degree of
                 parallelism in execution and permits a compiler to
                 generate highly optimized code to manage the
                 interaction among parallel functions. Floating-point
                 arithmetic is integrated into the architecture, and
                 floating-point performance is comparable to that of
                 many vector processors.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C5220 (Computer architecture); C6140B
                 (Machine-oriented languages)",
  classification = "C5220 (Computer architecture); C6140B
                 (Machine-oriented languages)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arithmetic; Compiler; compiler; floating-point;
                 Floating-point arithmetic; Floating-point performance;
                 floating-point performance; Floating-point performance,
                 Register partition; IBM computers; IBM RISC System/6000
                 processor architecture; IBM RISC System\slash 6000
                 processor architecture; interaction management;
                 Interaction management; Multiple ALUs; multiple ALUs;
                 optimized code; Optimized code; parallel functions;
                 Parallel functions; Parallelism; parallelism; reduced
                 instruction set computing; Register partition; register
                 partition",
  thesaurus =    "IBM computers; Reduced instruction set computing",
  treatment =    "P Practical",
}

@Article{Grohoski:1990:MOI,
  author =       "G. F. Grohoski",
  title =        "Machine organization of the {IBM RISC System}\slash
                 6000 processor",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "37--58",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401F.pdf",
  abstract =     "The IBM RISC System\slash 6000 processor is
                 second-generation RISC processor which reduces the
                 execution pipeline penalties caused by branch
                 instructions and also provides high floating-point
                 performance. It employs multiple functional units which
                 operate concurrently to maximize the instruction
                 execution rate. By employing these advanced
                 machine-organization techniques, it can execute up to
                 four instructions simultaneously. Approximately 11
                 MFLOPS are achieved on the LINPACK benchmarks.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Adv. Workstations Div., Austin, TX, USA",
  classcodes =   "C5220 (Computer architecture); C6140B
                 (Machine-oriented languages)",
  classification = "C5220 (Computer architecture); C6140B
                 (Machine-oriented languages)",
  corpsource =   "IBM Adv. Workstations Div., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "11 MFLOPS; 11 MFLOPS, Machine organization; branch
                 instructions; Branch instructions; Concurrent
                 operation; concurrent operation; Execution pipeline
                 penalties; execution pipeline penalties; floating-point
                 performance; high; High floating-point performance; IBM
                 computers; IBM RISC; IBM RISC System/6000 processor;
                 IBM RISC System\slash 6000 processor; instruction
                 execution rate; Instruction execution rate; LINPACK
                 benchmarks; machine organization; Machine organization;
                 machine-organization; Machine-organization techniques;
                 Maximize; maximize; multiple functional units; Multiple
                 functional units; reduced instruction set computing;
                 Second-generation RISC processor; second-generation
                 RISC processor; System/6000 processor; techniques",
  numericalindex = "Computer speed 1.1E+07 FLOPS",
  thesaurus =    "IBM computers; Reduced instruction set computing",
  treatment =    "P Practical",
}

@Article{Montoye:1990:DIR,
  author =       "R. K. Montoye and E. Hokenek and S. L. Runyon",
  title =        "Design of the {IBM RISC System\slash 6000}
                 floating-point execution unit",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "59--70",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  DOI =          "https://doi.org/10.1147/rd.341.0059",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401G.pdf",
  abstract =     "The IBM RISC System\slash 6000 (RS\slash 6000)
                 floating-point unit (FPU) exemplifies a
                 second-generation RISC CPU architecture and an
                 implementation which greatly increases floating-point
                 performance and accuracy. The key feature of the FPU is
                 a unified floating-point multiply-add-fused unit (MAF)
                 which performs the accumulate operation (A*B)+C as an
                 indivisible operation. The paper first discusses the
                 motivation for MAF, explaining in some detail why it is
                 an appropriate addition to the floating-point
                 architecture in VLSI. A summary of floating-point
                 operations is then given, with a discussion to
                 demonstrate the parallelism that is possible when the
                 multiply and add are fused. This is followed by a
                 description of the two-stage pipeline used for the
                 version of IEEE double-precision floating-point
                 arithmetic used in the RS\slash 6000 processor, with
                 delays consistent with its over-all superscalar
                 second-generation RISC architecture. Then the paper
                 describes the interaction of logical and physical
                 design required to incorporate several advances in VLSI
                 arithmetic while accommodating required delay and
                 technological (physical) constraints. The results are
                 then summarized.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B1265B (Logic circuits); B1130B (Computer-aided
                 circuit analysis and design); B1265F (Microprocessors
                 and microcomputers); C5230 (Digital arithmetic
                 methods); C5220 (Computer architecture); C5210B
                 (Computer-aided logic design)C7410D (Electronic
                 engineering)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); B1265F (Microprocessors and
                 microcomputers); C5210B (Computer-aided logic design);
                 C5220 (Computer architecture); C5230 (Digital
                 arithmetic methods); C7410D (Electronic engineering)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorrktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Accumulate operation; accumulate operation;
                 arithmetic; CAD; circuit layout CAD; digital
                 arithmetic; floating-point architecture; Floating-point
                 architecture; generation RISC CPU architecture; IBM
                 computers; IBM RISC System/6000 floating-point
                 execution unit; IBM RISC System\slash 6000
                 floating-point execution unit; IEEE double-precision
                 floating-point; IEEE double-precision floating-point
                 arithmetic; indivisible; Indivisible operation; logic;
                 multiply-add-fused unit; operation; Parallelism;
                 parallelism; reduced instruction set computing;
                 second-; Second-generation RISC CPU architecture; stage
                 pipeline; Superscalar second-generation RISC
                 architecture; superscalar second-generation RISC
                 architecture; two-; Two-stage pipeline; unified
                 floating-point; Unified floating-point
                 multiply-add-fused unit; VLSI arithmetic; VLSI
                 arithmetic, IBM RISC System/6000 floating-point
                 execution unit",
  thesaurus =    "Circuit layout CAD; Digital arithmetic; IBM computers;
                 Logic CAD; Reduced instruction set computing",
  treatment =    "P Practical",
}

@Article{Hokenek:1990:LZA,
  author =       "E. Hokenek and R. K. Montoye",
  title =        "Leading-zero anticipator ({LZA}) in the {IBM RISC
                 System\slash 6000} floating-point execution unit",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "71--77",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401H.pdf",
  abstract =     "Presents a novel technique used in the
                 multiply-add-fused (MAF) unit of the IBM RISC
                 System\slash 6000 (RS\slash 6000) processor for
                 normalizing the floating-point results. Unlike the
                 conventional procedures applied thus far, the so-called
                 leading-zero anticipator (LZA) of the RS\slash 6000
                 carries out processing of the leading zeros and ones in
                 parallel with floating-point addition. Therefore, the
                 new circuitry reduces the total latency of the MAF unit
                 by enabling the normalization and addition to take
                 place in a single cycle.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B1265B (Logic circuits); C5230 (Digital arithmetic
                 methods)",
  classification = "B1265B (Logic circuits); C5230 (Digital arithmetic
                 methods)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "add-fused; Circuitry; circuitry; computing; digital
                 arithmetic; floating-; Floating-point addition; IBM
                 computers; IBM RISC System/6000 floating-point
                 execution unit; IBM RISC System\slash 6000
                 floating-point execution unit; Latency; latency;
                 Leading-zero anticipator; leading-zero anticipator;
                 multiply-; Multiply-add-fused; Normalization;
                 normalization; Parallel; parallel; point addition;
                 reduced instruction set",
  thesaurus =    "Digital arithmetic; IBM computers; Reduced instruction
                 set computing",
  treatment =    "P Practical",
}

@Article{Ratiu:1990:PBS,
  author =       "I. M. Ratiu and H. B. Bakoglu",
  title =        "Pseudorandom built-in self-test methodology and
                 implementation for the {IBM RISC System}\slash 6000
                 processor",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "78--84",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401I.pdf",
  abstract =     "The paper describes a unified self-test and system
                 bring-up methodology. The components involved include a
                 common on-chip processor (COP) that executes the chip
                 self-test sequence and provides an interface to the COP
                 bus, a serial bus (COP bus) that links the chips to OCS
                 and ESP, an on-card sequencer (OCS) that controls the
                 self-test and system initialization sequences, and an
                 engineering support processor (ESP) that is used for
                 system verification, bring-up, and debug. Almost all
                 RISC System/6000 chips contain embedded RAMs such as
                 register files, caches, and directories; therefore, the
                 self-test methodology described is particularly
                 suitable for logic chips that contain embedded arrays.
                 Logic and RAM self-test is executed by a control
                 processor (COP) integrated on the chips. The COP
                 controls the self-test sequence, generates pseudorandom
                 test vectors, scans them into chip registers, and
                 provides the select lines that establish a one-to-one
                 correspondence between RAM input/output and chip
                 registers.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Adv. Workstations Div., Austin, TX, USA",
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); B1265F (Microprocessors and
                 microcomputers); B0170E (Production facilities and
                 engineering); C5470 (Performance evaluation and
                 testing); C7410H (Instrumentation)",
  classification = "B0170E (Production facilities and engineering);
                 B1265B (Logic circuits); B1265F (Microprocessors and
                 microcomputers); B2570 (Semiconductor integrated
                 circuits); C5470 (Performance evaluation and testing);
                 C7410H (Instrumentation)",
  corpsource =   "IBM Adv. Workstations Div., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic testing; caches; Caches; chip processor;
                 chip registers; Chip registers; chip self-test
                 sequence; Chip self-test sequence; common on-; Common
                 on-chip processor; computer testing; control; Control
                 processor; COP bus; debug; Debug; directories;
                 Directories; embedded arrays; Embedded arrays; embedded
                 RAMs; Embedded RAMs; engineering support processor;
                 Engineering support processor; ESP; IBM computers; IBM
                 RISC System/6000; IBM RISC System/6000 processor;
                 initialization; instruction set computing; integrated
                 circuit testing; interface; Interface; lines; logic
                 chips; Logic chips; logic testing; OCS; on-card
                 sequencer; On-card sequencer; processor; pseudorandom
                 built-in self-test; Pseudorandom built-in self-test;
                 pseudorandom test vectors; Pseudorandom test vectors;
                 reduced; register files; Register files; select; Select
                 lines; serial bus; Serial bus; system; system bring-up;
                 System bring-up; System initialization; System
                 verification; unified self-test; Unified self-test;
                 verification",
  thesaurus =    "Automatic testing; Computer testing; IBM computers;
                 Integrated circuit testing; Logic testing; Reduced
                 instruction set computing",
  treatment =    "P Practical",
}

@Article{Warran:1990:ISI,
  author =       "H. S. {Warran, Jr.}",
  title =        "Instruction scheduling for the {IBM RISC System\slash
                 6000} processor",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "85--92",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401J.pdf",
  abstract =     "For fast execution on the IBM RISC System/6000
                 processor, instructions should be arranged in an order
                 that uses the arithmetic units as efficient as
                 possible. The paper describes the scheduling
                 requirements of the machine, and a scheduling algorithm
                 for it that is used in two compilers.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6150C (Compilers, interpreters and other processors);
                 C6110 (Systems analysis and programming)",
  classification = "C6110 (Systems analysis and programming); C6150C
                 (Compilers, interpreters and other processors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arithmetic units; Arithmetic units; compilers;
                 Compilers; IBM computers; IBM RISC System/6000
                 processor; instruction scheduling; Instruction
                 scheduling; parallel programming; program compilers;
                 reduced instruction set computing; scheduling;
                 scheduling algorithm; Scheduling algorithm",
  thesaurus =    "IBM computers; Parallel programming; Program
                 compilers; Reduced instruction set computing;
                 Scheduling",
  treatment =    "P Practical",
}

@Article{Golumbic:1990:ISB,
  author =       "M. C. Golumbic and V. Rainish",
  title =        "Instruction scheduling beyond basic blocks",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "93--97",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401K.pdf",
  abstract =     "Instruction scheduling consists of the rearrangement
                 or transformation of program statements, usually at the
                 intermediate language or assembly code level, in order
                 to reduce possible run-time delays between
                 instructions. Such transformations must preserve data
                 dependency and are subject to other constraints. Highly
                 optimizing compilers employing instruction-scheduling
                 techniques have proven to be effective in improving the
                 performance of pipeline processors. Considerable
                 attention has been given to scheduling code within the
                 scope of basic blocks. The paper presents techniques
                 for scheduling beyond basic blocks. This allows a
                 further reduction in run-time delays such as those due,
                 e.g. to branches and loops, enabling the exploiting of
                 pipeline architectures which would not otherwise be
                 possible.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Israel Sci. and Technol. Center, Haifa, Israel",
  classcodes =   "C6150C (Compilers, interpreters and other processors);
                 C6110 (Systems analysis and programming)",
  classification = "C6110 (Systems analysis and programming); C6150C
                 (Compilers, interpreters and other processors)",
  corpsource =   "IBM Israel Sci. and Technol. Center, Haifa, Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Assembly code; assembly code; Compilers; compilers;
                 constraints; Constraints; data; Data dependency;
                 dependency; IBM computers; Instruction-scheduling;
                 instruction-scheduling; Intermediate language;
                 intermediate language; parallel programming; Pipeline
                 architectures; pipeline architectures; pipeline
                 processors; Pipeline processors; program compilers;
                 program statements; Program statements; Rearrangement;
                 rearrangement; reduced instruction set computing;
                 run-time delays; Run-time delays; scheduling;
                 transformation; Transformation",
  thesaurus =    "IBM computers; Parallel programming; Program
                 compilers; Reduced instruction set computing;
                 Scheduling",
  treatment =    "P Practical",
}

@Article{Auslander:1990:MPL,
  author =       "M. A. Auslander",
  title =        "Managing programs and libraries in {AIX} Version 3 for
                 {RISC System\slash 6000} processors",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "98--104",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401L.pdf",
  abstract =     "The paper describes the program and program-library
                 management facility that has been developed for the AIX
                 operating system, Version 3, as implemented for the IBM
                 POWER architecture. It provides run-time loading of
                 libraries, symbol resolution with type checking, and
                 relocation. In addition, the use of the loader to add
                 programs to an already running process or to the kernel
                 is offered. The advantages of these functions and the
                 techniques needed to provide a usable and efficient
                 realization are described. Particular attention is
                 given to the special problems posed by very large
                 programs, and by very small programs which use services
                 from very large libraries.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6150J (Operating systems)",
  classification = "C6150J (Operating systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AIX operating system; AIX Version 3; IBM computers;
                 IBM POWER architecture; instruction set computing;
                 management; operating systems (computers);
                 program-library; Program-library management; reduced;
                 RISC System/6000 processors; Run-time loading; run-time
                 loading; Symbol resolution; symbol resolution; Type
                 checking; type checking",
  thesaurus =    "IBM computers; Operating systems [computers]; Reduced
                 instruction set computing",
  treatment =    "P Practical",
}

@Article{Chang:1990:ESF,
  author =       "A. Chang and M. F. Mergen and R. K. Rader and J. A.
                 Roberts and S. L. Porter",
  title =        "Evolution of storage facilities in {AIX} Version 3 for
                 {RISC System\slash 6000} processors",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "105--110",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401M.pdf",
  abstract =     "The AIX Version 3 storage facilities include features
                 not found in other implementations of the UNIX
                 operating system. Maximum virtual memory is more than
                 1000 terabytes and is used pervasively to access all
                 files and the meta-data of the file systems. Each
                 separate file system (subtree) of the file name
                 hierarchy occupies a logical disk volume, composed of
                 space from possibly several disks. Database memory (a
                 variant of virtual memory) and other database
                 techniques are used to manage file system meta-data.
                 These features provide the capacity to address large
                 applications and many users, simplified program access
                 to file data, efficient file buffering in memory,
                 flexible management of disk space, and reliable file
                 systems with short restart time.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6150J (Operating systems); C6120 (File
                 organisation)",
  classification = "C6120 (File organisation); C6150J (Operating
                 systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(computers); AIX Version 3; AIX Version 3 storage
                 facilities; buffering; database memory; Database
                 memory; disk space; Disk space; file; File buffering;
                 file data; File data; file name hierarchy; File name
                 hierarchy; file organisation; file systems; File
                 systems; flexible management; Flexible management; IBM
                 computers; logical disk volume; Logical disk volume;
                 meta-data; Meta-data; operating systems; program
                 access; Program access; reduced instruction set
                 computing; reliable file; Reliable file systems;
                 restart time; Restart time; RISC System/6000
                 processors; storage; storage facilities; subtree;
                 Subtree; systems; UNIX operating system; virtual;
                 virtual memory; Virtual memory",
  thesaurus =    "File organisation; IBM computers; Operating systems
                 [computers]; Reduced instruction set computing; Virtual
                 storage",
  treatment =    "P Practical",
}

@Article{Markstein:1990:CEF,
  author =       "P. W. Markstein",
  title =        "Computation of elementary functions on the {IBM RISC
                 System\slash 6000} processor",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "111--119",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65-04 (65D20)",
  MRnumber =     "1 057 659",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401N.pdf",
  abstract =     "The additional speed and precision of the IBM RISC
                 System\slash 6000 floating-point unit have motivated
                 reexamination of algorithms to perform division, square
                 root, and the elementary functions. New results are
                 obtained which avoid the necessity of doing special
                 testing to get the last bit rounded correctly in
                 accordance with all of the IEEE rounding modes in the
                 case of division and square root. For the elementary
                 function library, a technique is described for always
                 getting the last bit rounded correctly in the selected
                 IEEE rounding mode.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Austin, TX, USA",
  classcodes =   "C5230 (Digital arithmetic methods)",
  classification = "C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Res. Div., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computing; digital arithmetic; division; Division;
                 elementary functions; Elementary functions;
                 floating-point unit; Floating-point unit; IBM
                 computers; IBM RISC System/6000 processor; IBM RISC
                 System\slash 6000 processor; IEEE rounding; IEEE
                 rounding modes; IEEE rounding modes, IBM RISC
                 System/6000 processor; modes; reduced instruction set;
                 square root; Square root",
  thesaurus =    "Digital arithmetic; IBM computers; Reduced instruction
                 set computing",
  treatment =    "P Practical",
}

@Article{Anonymous:1990:RPI,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "120--130",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:42:18 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401O.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1990:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "1",
  pages =        "131--136",
  month =        jan,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:42:18 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/341/ibmrd3401P.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{May:1990:P,
  author =       "Paul G. May",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "139--140",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:11:26 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wiesenfeld:1990:ESH,
  author =       "J. M. Wiesenfeld",
  title =        "Electro-optic sampling of high-speed devices and
                 integrated circuits",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "141--161",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The operating speeds of the fastest electronic devices
                 and integrated circuits (ICs) have surpassed the
                 capabilities of conventional electronic measurement
                 instrumentation. Electro-optic sampling is an optical
                 probing technique which has ultrashort temporal
                 resolution and is capable of noninvasively probing ICs
                 at internal nodes. This technique is voltage-sensitive
                 because it relies upon the electric field produced by
                 the signal voltage on the device under test (DUT). The
                 electric field (and hence and voltage) can be sampled
                 because it produces birefringence in an electro-optic
                 crystal which changes the state of polarization of an
                 ultrashort-duration optical probe pulse that propagates
                 through the electro-optic crystal. The electro-optic
                 crystal is the substrate of the DUT for direct probing,
                 is a crystal on a separate test structure for hybrid
                 probing, and is a separate crystal placed above the DUT
                 for external probing. Temporal resolution below 1 ps
                 and a sensitivity below 0.1 mV/ square root Hz have
                 been demonstrated (though not in the same experiment).
                 The principles of electro-optic sampling are reviewed
                 in this paper. Selected applications for measurement of
                 high-speed waveforms in discrete devices and in ICs are
                 presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "AT and T Bell Labs., Holmdel, NJ, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits); B4150
                 (Electro-optical devices); B7230 (Sensing devices and
                 transducers)",
  classification = "B2570 (Semiconductor integrated circuits); B4150
                 (Electro-optical devices); B7230 (Sensing devices and
                 transducers)",
  corpsource =   "AT and T Bell Labs., Holmdel, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Birefringence; birefringence; circuits; Electric
                 field; electric field; Electro-optic sampling;
                 electro-optic sampling; electro-optical devices;
                 Electronic devices; electronic devices; integrated;
                 integrated circuit testing; Integrated circuits;
                 Optical probing; optical probing; probes; semiconductor
                 device testing; Substrate; substrate; Ultrashort
                 temporal resolution; ultrashort temporal resolution",
  thesaurus =    "Electro-optical devices; Integrated circuit testing;
                 Probes; Semiconductor device testing",
  treatment =    "B Bibliography; P Practical; X Experimental",
}

@Article{Heinrich:1990:PNO,
  author =       "H. K. Heinrich",
  title =        "Picosecond noninvasive optical detection of internal
                 electrical signals in flip-chip-mounted silicon
                 integrated circuits",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "162--172",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper reviews the charge-sensing optical probing
                 system, and shows how it may be used to detect internal
                 current and voltage signals in flip-chip-mounted
                 silicon integrated circuits. Previously, researchers
                 have used this concept to detect both single-shot
                 200-MHz-bandwidth signals, without averaging, and
                 8-GHz-bandwidth stroboscopic signals. This system has a
                 high sensitivity: 145-nA/ square root Hz current
                 sensitivity in typical bipolar transistors, and
                 1.35-mV/ square root Hz voltage sensitivity in typical
                 CMOS circuits (using a semiconductor laser probe). It
                 is noninvasive, has a potential submicron spatial
                 resolution, and should be capable of providing linear
                 and calibrated measurements. Therefore, this probing
                 approach should be a powerful tool for future circuit
                 analysis and testing.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits); B2220J
                 (Hybrid integrated circuits); B7230 (Sensing devices
                 and transducers)B0170E (Production facilities and
                 engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B2220J (Hybrid integrated circuits); B2570
                 (Semiconductor integrated circuits); B7230 (Sensing
                 devices and transducers)",
  corpsource =   "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bipolar transistors; bipolar transistors; calibrated;
                 Calibrated measurements; charge-sensing optical
                 probing; Charge-sensing optical probing system; Circuit
                 analysis; circuit analysis; circuit testing; circuits;
                 CMOS; CMOS circuits; Current sensitivity; current
                 sensitivity; flip-chip devices; flip-chip-mounted;
                 Flip-chip-mounted silicon integrated circuits;
                 high-speed optical techniques; integrated; Internal
                 electrical signals; internal electrical signals;
                 linear; Linear measurements; measurements; monolithic
                 integrated circuits; Picosecond noninvasive optical
                 detection; picosecond noninvasive optical detection;
                 probes; silicon integrated circuits; Submicron spatial
                 resolution; submicron spatial resolution; system",
  thesaurus =    "Flip-chip devices; High-speed optical techniques;
                 Integrated circuit testing; Monolithic integrated
                 circuits; Probes",
  treatment =    "P Practical; X Experimental",
}

@Article{Clauberg:1990:PPP,
  author =       "R. Clauberg and H. Beha and A. Blacha and H. K.
                 Seitz",
  title =        "Picosecond photoemission probing of integrated
                 circuits: Capabilities, limitations, and applications",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "173--188",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The capabilities and limitations of the novel
                 photoemission probing technique for signal measurements
                 on internal nodes of VLSI integrated circuits are
                 reviewed with respect to the range of possible
                 applications of this method. Aspects such as voltage
                 sensitivity, time resolution, minimum accessible
                 feature size, sensitivity to perturbation effects, and
                 impact on the circuit under test are considered. It is
                 concluded that the especially high voltage sensitivity
                 of this new method opens the field of diagnostics of
                 circuits with ultrafast devices but partly low signal
                 repetition rates, which is not accessible by other
                 means. Such chips include, for example, complex logic
                 chips and special telecommunication chips.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Zurich Res. Lab., Ruschlikon,
                 Switzerland",
  classcodes =   "B2570 (Semiconductor integrated circuits); B2320
                 (Electron emission, materials and cathodes); B0170E
                 (Production facilities and engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B2320 (Electron emission, materials and cathodes);
                 B2570 (Semiconductor integrated circuits)",
  corpsource =   "Div. of IBM Res., Zurich Res. Lab., Ruschlikon,
                 Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "devices; effects; integrated circuit testing;
                 Integrated circuits; integrated circuits; Minimum
                 accessible feature size; minimum accessible feature
                 size; perturbation; Perturbation effects;
                 photoemission; photoemissive; Picosecond photoemission
                 probing; picosecond photoemission probing; probes;
                 resolution; Signal measurements; signal measurements;
                 time; Time resolution; VLSI; Voltage sensitivity;
                 voltage sensitivity",
  thesaurus =    "Integrated circuit testing; Photoemission;
                 Photoemissive devices; Probes; VLSI",
  treatment =    "P Practical; X Experimental",
}

@Article{Winkler:1990:FPP,
  author =       "D. Winkler and R. Schmitt and M. Brunner and B.
                 Lischke",
  title =        "Flexible picosecond probing of integrated circuits
                 with chopped electron beams",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "189--203",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The effective design and evaluation of high-speed
                 integrated circuits is supported by internal
                 noninvasive voltage-measurement techniques with
                 picosecond time resolution. An electron-beam tester has
                 therefore been developed which approaches the
                 theoretical time-resolution limit of this method. It is
                 based on the well-established e-beam technique for VLSI
                 circuits, allowing for high flexibility in driving
                 different kinds of high-frequency circuits under both
                 conventional and critical conditions. The electron
                 pulses of the stroboscopic test system are generated by
                 a two-stage chopping system which was optimized to
                 obtain very short pulses. It allows for a 7-ps
                 effective pulse width which simultaneously yields a
                 probe diameter of 0.5$\mu$m and a probe current of 1
                 nA. This current results in a noise voltage of 20 mV
                 when one period of a 1-GHz signal is recorded, with a
                 total acquisition time of 0.1 s. Long-range phase
                 shifting with high resolution is achieved by operating
                 the upper stage of the blanking system at a high
                 frequency and using the lower one as a selective gate.
                 This allows propagation-delay measurements to be
                 performed with a resolution of better than 2 ps over a
                 range of several $\mu$s.",
  acknowledgement = ack-nhfb,
  affiliation =  "Siemens Res. Labs., Munich, West Germany",
  classcodes =   "B2570 (Semiconductor integrated circuits); B7230
                 (Sensing devices and transducers); B0170E (Production
                 facilities and engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B2570 (Semiconductor integrated circuits); B7230
                 (Sensing devices and transducers)",
  corpsource =   "Siemens Res. Labs., Munich, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.5 Micron; 0.5 micron; 1 GHz; 1 NA; 1 nA; 20; 20 MV;
                 chopped; Chopped electron beams; circuit testing;
                 electron; electron beam applications; electron beams;
                 electron probes; Electron pulses; Electron-beam tester;
                 electron-beam tester; Flexible picosecond probing;
                 flexible picosecond probing; integrated; Integrated
                 circuits; integrated circuits; mV; Noninvasive
                 voltage-measurement techniques; noninvasive
                 voltage-measurement techniques; Propagation-delay
                 measurements; propagation-delay measurements; pulses;
                 Stroboscopic test system; stroboscopic test system;
                 Time-resolution limit; time-resolution limit; Two-stage
                 chopping system; two-stage chopping system; VLSI",
  numericalindex = "Size 5.0E-07 m; Frequency 1.0E+09 Hz; Current
                 1.0E-09 A; Voltage 2.0E-02 V",
  thesaurus =    "Electron beam applications; Electron probes;
                 Integrated circuit testing; VLSI",
  treatment =    "P Practical; X Experimental",
}

@Article{May:1990:PPM,
  author =       "P. May and Y. Pastol and J.-M. Halbout and G. Chiu",
  title =        "Picosecond photoelectron microscope for high-speed
                 testing of integrated circuits",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "204--214",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The performance of devices and circuits is advancing
                 at a rapid pace with the advent of submicron design
                 ground rules and switching times under 50 ps. The
                 requirements for probing the internal nodes of these
                 ulta-fast, -small, and -dense circuits give rise to
                 great challenges for high-speed electron-beam testing.
                 The authors review the steps which have allowed
                 electron-beam testing to achieve simultaneously 5-ps
                 temporal resolution, 0.1-$\mu$m spot size, and 3 mV/
                 square root Hz voltage sensitivity. The resulting newly
                 developed instrument, called the picosecond
                 photoelectron scanning electron microscope (PPSEM), is
                 capable of measuring the state-of-the-art bipolar and
                 FET circuits and also VLSI passive interconnects.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits); B2390
                 (Electron and ion microscopes); B0170E (Production
                 facilities and engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B2390 (Electron and ion microscopes); B2570
                 (Semiconductor integrated circuits)",
  corpsource =   "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bipolar circuits; bipolar circuits; circuit testing;
                 electron beam applications; electron microscopes;
                 electron probes; electron-beam; Electron-beam testing;
                 FET circuits; high-; High-speed testing; integrated;
                 Integrated circuits; integrated circuits;
                 interconnects; photoelectron spectroscopy; picosecond
                 photoelectron; Picosecond photoelectron microscope;
                 picosecond photoelectron microscope; Picosecond
                 photoelectron scanning electron microscope; Probing;
                 probing; scanning; scanning electron microscope; speed
                 testing; Temporal resolution; temporal resolution;
                 testing; VLSI; VLSI passive; VLSI passive
                 interconnects",
  thesaurus =    "Electron beam applications; Electron probes;
                 Integrated circuit testing; Photoelectron spectroscopy;
                 Scanning electron microscopes; VLSI",
  treatment =    "P Practical; X Experimental",
}

@Article{Fox:1990:SET,
  author =       "F. Fox and J. Kolzer and J. Otto and E. Plies",
  title =        "A submicron electron-beam tester for {VLSI} circuits
                 beyond the {4-Mb DRAM}",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "215--226",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper describes the electron-optical low-voltage
                 column of the submicron electron-beam tester. It can be
                 used to produce an electron probe of 0.12-$\mu$m
                 diameter, 2.5-nA probe current, and 1-kV beam voltage.
                 It is shown that in the case of waveform measurements
                 on 1.1-$\mu$m interconnection lines, the crosstalk is
                 only approximately 3\%. The voltage resolution is
                 sufficient to allow the sense signal of a 4-Mb DRAM
                 (dynamic random access memory) to be measured. Further
                 internal measurements with the electron probe for the
                 chip verification of the 4-Mb DRAM are also shown which
                 demonstrate the flexibility and the benefits of
                 electron-beam testing. On the basis of the measured
                 performance data and its successful use in the circuit
                 analysis of the 4-Mb DRAM, the submicron electron-beam
                 tester appears to be suitable also for VLSI circuits
                 with reduced design rules, e.g., for the 16-Mb DRAM.
                 The improvements required for such future applications
                 are briefly discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Siemens Res. Labs., Munich, West Germany",
  classcodes =   "B2570 (Semiconductor integrated circuits); B1265D
                 (Memory circuits); B0170E (Production facilities and
                 engineering); C5320G (Semiconductor storage)",
  classification = "B0170E (Production facilities and engineering);
                 B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits); C5320G (Semiconductor storage)",
  corpsource =   "Siemens Res. Labs., Munich, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.12; 0.12 Micron; 1 KV; 1 kV; 2.5 NA; 2.5 nA; 4 Mbit;
                 4-Mb DRAM; circuit testing; Dynamic random access
                 memory; dynamic random access memory; electron beam
                 applications; Electron probe; electron probe; electron
                 probes; Electron-optical low-voltage column;
                 electron-optical low-voltage column; integrated;
                 integrated memory circuits; micron; random-access;
                 storage; Submicron electron-beam tester; submicron
                 electron-beam tester; VLSI; VLSI circuits; Waveform
                 measurements; waveform measurements",
  numericalindex = "Size 1.2E-07 m; Current 2.5E-09 A; Voltage 1.0E+03
                 V; Storage capacity 4.2E+06 bit",
  thesaurus =    "Electron beam applications; Electron probes;
                 Integrated circuit testing; Integrated memory circuits;
                 Random-access storage; VLSI",
  treatment =    "P Practical",
}

@Article{Restle:1990:IPS,
  author =       "Phillip Restle and Antonio Gnudi",
  title =        "Internal probing of submicron {FETs} and photoemission
                 using individual oxide traps",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "227--242",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In submicron field-effect transistors with channel
                 area less than 0.5$\mu$m/sup 2/, the capture or
                 emission of a single electron (or hole) in the gate
                 oxide has an easily observable effect on the device
                 resistance. Measurements are described in which the
                 time and amplitude of the resistance change due to each
                 capture and emission event from an individual trap are
                 extracted to obtain the average capture and emission
                 times, and the amplitude of the resistance change, at
                 different temperatures, device biases, and light
                 intensities. Techniques are described for using the
                 data at different biases to characterize the trap, find
                 the location of the trap in the device, and then use
                 the trap as a probe of the oxide field (or surface
                 potential) and the surface charge density within a
                 5-50-AA radius of the trap. In some devices a single
                 trap can be resolved over almost all designed bias
                 regions of the FET near room temperature. In effect,
                 individual traps can be used as internal probes into
                 VLSI devices of the present and future. Results from 2D
                 computer device modeling of these devices are used to
                 evaluate and understand these techniques. Methods for
                 applying these techniques to the study of device
                 degradation are discussed. Data are presented in which
                 photoemission is observed from a single electron
                 trap.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  classcodes =   "B2560S (Other field effect devices); B2560B (Modelling
                 and equivalent circuits)",
  classification = "B2560B (Modelling and equivalent circuits); B2560S
                 (Other field effect devices)",
  corpsource =   "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2D computer device modeling; Device biases; device
                 biases; Device resistance; device resistance; device
                 testing; electron probes; Electron trap; electron trap;
                 electron traps; field effect transistors; Internal
                 probing; internal probing; Light intensities; light
                 intensities; oxide; Oxide traps; Photoemission;
                 photoemission; semiconductor; semiconductor device
                 models; Submicron FETs; submicron FETs; Surface charge
                 density; surface charge density; traps",
  thesaurus =    "Electron probes; Electron traps; Field effect
                 transistors; Photoemission; Semiconductor device
                 models; Semiconductor device testing",
  treatment =    "P Practical; X Experimental",
}

@Article{El-Kareh:1990:SMP,
  author =       "B. El-Kareh and W. R. Tonti and S. L. Titcomb",
  title =        "A submicron {MOSFET} parameter extraction technique",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "243--249",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A technique is introduced for measuring electron and
                 hole mobilities as a function of temperature and normal
                 field in inverted silicon surfaces. The authors also
                 introduce a new definition of threshold voltage which
                 allows the method to measure mobility independent of
                 channel dimensions and resistance in series with the
                 channel. The results are used to extract the resistance
                 in series with the channel, the effective channel
                 dimensions, and the intrinsic MOSFET transconductance.
                 The technique is demonstrated on MOSFETs with channel
                 lengths ranging from 0.25$\mu$m to 20$\mu$m.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  chemicalindex = "Si/sur Si/el",
  classcodes =   "B2560R (Insulated gate field effect transistors);
                 B2560B (Modelling and equivalent circuits); B7310
                 (Electric and magnetic variables)",
  classification = "B2560B (Modelling and equivalent circuits); B2560R
                 (Insulated gate field effect transistors); B7310
                 (Electric and magnetic variables)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.25 micron to 20 micron; 0.25 Micron to 20 micron;
                 carrier mobility; channel dimensions; Channel
                 dimensions; electric variables measurement; electron
                 mobilities; Electron mobilities; gate field effect
                 transistors; hole mobilities; Hole mobilities;
                 insulated; inverted silicon surfaces; Inverted silicon
                 surfaces; semiconductor device models; Si surface;
                 submicron MOSFET parameter extraction; Submicron MOSFET
                 parameter extraction technique; technique; threshold
                 voltage; Threshold voltage; transconductance;
                 Transconductance",
  numericalindex = "Size 2.5E-07 to 2.0E-05 m",
  thesaurus =    "Carrier mobility; Electric variables measurement;
                 Insulated gate field effect transistors; Semiconductor
                 device models",
  treatment =    "P Practical; X Experimental",
}

@Article{Golladay:1990:ETO,
  author =       "S. D. Golladay and N. A. Wagner and J. R. Rudert and
                 R. N. Schmidt",
  title =        "Electron-beam technology for open\slash short testing
                 of multi-chip substrates",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "250--259",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors discuss the need for noncontact electrical
                 testing of high-performance multi-chip substrates and
                 describe an electron-beam tester developed for this
                 application. They describe the operational principles
                 of the tester and compare and contrast its performance
                 with that of mechanical probe testers. Finally, they
                 discuss the motivations and technical issues involved
                 in extending the electron-beam test method to future
                 high-performance packages.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  classcodes =   "B2220 (Integrated circuits); B0170E (Production
                 facilities and engineering); B2570 (Semiconductor
                 integrated circuits); B0170J (Product packaging)",
  classification = "B0170E (Production facilities and engineering);
                 B0170J (Product packaging); B2220 (Integrated
                 circuits); B2570 (Semiconductor integrated circuits)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "electron beam applications; Electron beam technology;
                 electron beam technology; electron-beam; Electron-beam
                 tester; integrated circuit testing; Multichip
                 substrates; multichip substrates; Noncontact electrical
                 testing; noncontact electrical testing; open/short;
                 Open/short testing; Operational principles; operational
                 principles; packaging; substrates; tester; testing",
  thesaurus =    "Electron beam applications; Integrated circuit
                 testing; Packaging; Substrates",
  treatment =    "P Practical; X Experimental",
}

@Article{Rodriguez:1990:DUV,
  author =       "C. W. Rodriguez and D. E. Hoffman",
  title =        "The development of ultra-high-frequency {VLSI} device
                 test systems",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "260--275",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The development of test systems for high-performance
                 semiconductor logic and memory devices is discussed.
                 The capabilities of shared-resource and tester-per-pin
                 system architectures are reviewed. Test-system hardware
                 design to provide high-speed pin electronics and
                 generation of LSSD, weighted random, and algorithmic
                 patterns is described. The reasons for the selection of
                 the tester-per-pin system architecture are given in
                 terms of the way in which overall system accuracy and
                 test-system user flexibility are maximized for
                 differing test methodologies.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  classcodes =   "B2570 (Semiconductor integrated circuits); B1265B
                 (Logic circuits); B1265D (Memory circuits); B0170E
                 (Production facilities and engineering); B7210B
                 (Automatic test and measurement systems)",
  classification = "B0170E (Production facilities and engineering);
                 B1265B (Logic circuits); B1265D (Memory circuits);
                 B2570 (Semiconductor integrated circuits); B7210B
                 (Automatic test and measurement systems)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Algorithmic patterns; algorithmic patterns; ATE;
                 automatic test equipment; electronics; integrated
                 circuit testing; integrated logic circuits; integrated
                 memory circuits; LSSD; Memory devices; memory devices;
                 pin; Pin electronics; Semiconductor logic;
                 semiconductor logic; Shared-resource; shared-resource;
                 Tester-per-pin system; tester-per-pin system; UHF VLSI
                 device test systems; VLSI; Weighted random; weighted
                 random",
  thesaurus =    "Automatic test equipment; Integrated circuit testing;
                 Integrated logic circuits; Integrated memory circuits;
                 VLSI",
  treatment =    "P Practical; X Experimental",
}

@Article{Vida-Torku:1990:TGV,
  author =       "E. K. Vida-Torku and J. A. Monzel and T. L. Bossis and
                 C. E. Radke and D. M. Wu",
  title =        "Test generation for {VLSI} chips with embedded
                 memories",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "276--288",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An effective approach for generating patterns for
                 testing memories embedded in logic is presented.
                 Through circuit testability analysis, which is a study
                 of the effect of process defects on memory circuits,
                 unique algorithms can be derived for testing the
                 memory. Circuit and logic designs for test features
                 that are required to make the pattern generation
                 process optimal are discussed. An analytical method is
                 described which assesses the performance
                 characteristics of the memory after functional test.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  classcodes =   "B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits); B1265B (Logic circuits); B0170E
                 (Production facilities and engineering); C5320G
                 (Semiconductor storage); C5210 (Logic design methods)",
  classification = "B0170E (Production facilities and engineering);
                 B1265B (Logic circuits); B1265D (Memory circuits);
                 B2570 (Semiconductor integrated circuits); C5210 (Logic
                 design methods); C5320G (Semiconductor storage)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit; Circuit testability analysis; embedded
                 memories; Embedded memories; integrated circuit
                 testing; integrated memory circuits; logic design;
                 logic designs; Logic designs; pattern generation
                 process; Pattern generation process; performance
                 characteristics; Performance characteristics; process
                 defects; Process defects; test generation; Test
                 generation; testability analysis; VLSI; VLSI chips",
  thesaurus =    "Integrated circuit testing; Integrated memory
                 circuits; Logic design; VLSI",
  treatment =    "P Practical",
}

@Article{Huisman:1990:SEM,
  author =       "Leendert M. Huisman",
  title =        "Simulation of embedded memories by defective hashing",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "289--298",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Because logic designs are becoming more complex and
                 extensive, they increasingly tend to contain embedded
                 memories. In the simulation (particularly fault
                 simulation) of these designs, the embedded memories may
                 be found to require large amounts of storage unless a
                 carefully designed simulation strategy is adopted. This
                 paper describes a technique that drastically reduces
                 the storage required in the fault simulation of such
                 large designs. The required amount of storage can be
                 fixed at compile time or at load time, and can almost
                 always be made to fit in the available storage at the
                 cost of only a small decrease in the predicted exposure
                 probabilities.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  classcodes =   "B1265D (Memory circuits); B1265B (Logic circuits);
                 C5210 (Logic design methods); C5320G (Semiconductor
                 storage); C6120 (File organisation)",
  classification = "B1265B (Logic circuits); B1265D (Memory circuits);
                 C5210 (Logic design methods); C5320G (Semiconductor
                 storage); C6120 (File organisation)",
  corpsource =   "Div. of IBM Res., Thomas J. Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Defective hashing; defective hashing; Embedded
                 memories; embedded memories; fault; fault location;
                 Fault simulation; file organisation; logic; logic
                 design; Logic designs; logic designs; semiconductor
                 storage; simulation; testing",
  thesaurus =    "Fault location; File organisation; Logic design; Logic
                 testing; Semiconductor storage",
  treatment =    "P Practical",
}

@Article{Motika:1990:LCD,
  author =       "F. Motika and N. N. Tendolkar and C. C. Beh and W. R.
                 Heller and C. E. Radke and P. J. Nigh",
  title =        "A logic chip delay-test method based on system
                 timing",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "299--313",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors present a novel approach to delay-testing
                 of VLSI logic chips based on the level-sensitive scan
                 design (LSSD) methodology. The objective of the delay
                 test is to reduce significantly the failures of
                 multi-chip modules at system integration test while
                 minimizing the complexity and cost of subassembly
                 testing. Because system timing data are used to derive
                 test specifications, the delay defects that are most
                 likely to cause a system path failure are detected a
                 high percentage of the time. With the implementation of
                 the delay test in the wafer production line, the system
                 final-test failure rate of multi-chip modules used in
                 IBM mainframe machines has dropped significantly.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); B0170E (Production facilities and
                 engineering); C5210 (Logic design methods)",
  classification = "B0170E (Production facilities and engineering);
                 B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210 (Logic design methods)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "delays; integrated logic circuits; level-;
                 Level-sensitive scan design; logic chip delay-test
                 method; Logic chip delay-test method; logic testing;
                 sensitive scan design; system integration test; System
                 integration test; system timing; System timing; VLSI",
  thesaurus =    "Delays; Integrated logic circuits; Logic testing;
                 VLSI",
  treatment =    "P Practical",
}

@Article{Wong:1990:ATS,
  author =       "R. C. Wong",
  title =        "An {AC} test structure for fast memory arrays",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "314--324",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An AC test structure (ACTS) built into fast memory
                 arrays is required to make them truly AC-testable, with
                 5-10\% timing accuracy. Since their AC performance is
                 very difficult to characterize, wafer tester timing
                 uncertainty is generally about 10-50\% of a typical
                 array access time. More accurate testers are complex
                 and expensive; they require long development time and
                 have complicated operation procedures. ACTS is a
                 simpler, cheaper, and more practical means of achieving
                 greater accuracy. An AC test structure is composed of a
                 tunable timer and path-shifting oscillators (PSOs)
                 built around the various access paths of the array. The
                 timer generates the array clocks with adjustable pulse
                 widths, and the PSOs transform time intervals into
                 frequencies. In the future, tester accuracy will
                 improve, but memory performance will have accelerated
                 even more. Thus, the need for ACTS is critical and will
                 remain so in the foreseeable future.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  classcodes =   "B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits); B0170E (Production facilities and
                 engineering); C5150 (Other circuits for digital
                 computers); C7410D (Electronic engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B1265D (Memory circuits); B2570 (Semiconductor
                 integrated circuits); C5150 (Other circuits for digital
                 computers); C7410D (Electronic engineering)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AC test structure; adjustable; Adjustable pulse
                 widths; array access time; Array access time; array
                 clocks; Array clocks; automatic testing; fast memory
                 arrays; Fast memory arrays; frequencies; Frequencies;
                 integrated; integrated circuit testing; memory
                 circuits; path-shifting oscillators; Path-shifting
                 oscillators; pulse widths; storage management chips;
                 time intervals; Time intervals; timer; timing accuracy;
                 Timing accuracy; tunable; Tunable timer; wafer tester
                 timing uncertainty; Wafer tester timing uncertainty",
  thesaurus =    "Automatic testing; Integrated circuit testing;
                 Integrated memory circuits; Storage management chips",
  treatment =    "P Practical",
}

@Article{Bula:1990:GDD,
  author =       "O. Bula and J. Moser and J. Trinko and M. Weissman and
                 F. Woytowich",
  title =        "Gross delay defect evaluation for a {CMOS} logic
                 design system product",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "325--338",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Randomly occurring gross delay defects allow chips to
                 pass full stuck-fault testing at both wafer and module
                 levels, but cause them to fail when operated at system
                 speeds. The paper describes the results of an
                 experiment designed to determine the actual delay
                 defect component of shipped product quality level
                 (SPQL) for a CMOS combination standard cell/gate array
                 design system. More than 60000 modules, representing
                 chips from the same IBM computer system, have been
                 delay-tested using the technique presented. The test
                 technique uses the stuck-fault patterns for a
                 level-sensitive scan design (LSSD) product. The
                 stuck-fault patterns are modified or `twisted'
                 according to specific algorithms to propagate
                 transitions through paths just prior to the output
                 measure. The patterns are applied at system speed
                 timings provided by the chip designers. Any gross delay
                 defect present in a tested path causes a fail. The
                 failing modules were characterized to determine the
                 size of the delay defects. Failure diagnostics were
                 performed on the defective modules. These were sent to
                 physical failure analysis for delayering, visual
                 verification, and electrical characterization. A
                 summary of physical defects which produced gross delay
                 defects is presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B1265B (Logic circuits); B2570D (CMOS integrated
                 circuits); C5210 (Logic design methods); C7410D
                 (Electronic engineering)",
  classification = "B1265B (Logic circuits); B2570D (CMOS integrated
                 circuits); C5210 (Logic design methods); C7410D
                 (Electronic engineering)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; automatic testing; characterization; Chips;
                 chips; circuit testing; CMOS combination standard
                 cell/gate array design; CMOS combination standard
                 cell/gate array design system; CMOS integrated
                 circuits; CMOS logic; CMOS logic design system; Delay
                 defect component; delay defect component; Delay-tested;
                 delay-tested; Delayering; delayering; design system;
                 electrical; Electrical characterization; Failure
                 diagnostics; failure diagnostics; full stuck-fault;
                 Full stuck-fault testing; Gross delay defects; gross
                 delay defects; IBM computer system; integrated; level;
                 Level-sensitive scan design; level-sensitive scan
                 design; logic arrays; logic design; logic testing;
                 Module level; module level; Output measure; output
                 measure; patterns; Physical defects; physical defects;
                 physical failure; Physical failure analysis; shipped
                 product quality; Shipped product quality level;
                 stuck-fault; Stuck-fault patterns; system; System speed
                 timings; system speed timings; Tested path; tested
                 path; testing; Visual verification; visual
                 verification; Wafer level; wafer level",
  thesaurus =    "Automatic testing; CMOS integrated circuits;
                 Integrated circuit testing; Logic arrays; Logic design;
                 Logic testing",
  treatment =    "P Practical",
}

@Article{Bassett:1990:BDP,
  author =       "R. W. Bassett and M. E. Turner and J. H. Panner and P.
                 S. Gillis and S. F. Oakland and D. W. Stout",
  title =        "Boundary-scan design principles for efficient {LSSD
                 ASIC} testing",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "339--354",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A boundary-scan logic design method that depends only
                 on level-sensitive scan design (LSSD) principles has
                 been developed for IBM CMOS application-specific
                 integrated circuit (ASIC) products. This technique
                 permits comprehensive testing of LSSD ASICs with high
                 signal input/output pin counts, using relatively
                 inexpensive reduced-pin-count automatic test equipment
                 (ATE). The paper describes the LSSD logic structures
                 required, the reduced-pin-count testing and burn-in
                 processes used, and the ASIC product design decisions
                 that must be made to establish a consistent
                 boundary-scan implementation.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Syst. Tehnol. Div., Essex Junction, VT, USA",
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210 (Logic design methods)",
  classification = "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210 (Logic design methods)",
  corpsource =   "IBM Syst. Tehnol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits; ASIC product
                 design; Boundary-scan logic design; boundary-scan logic
                 design; Burn-in; burn-in; IBM CMOS
                 application-specific; IBM CMOS application-specific
                 integrated circuit; integrated circuit; level-;
                 Level-sensitive scan design; logic design; LSSD ASIC
                 testing; LSSD logic structures; pin-count automatic
                 test equipment; reduced-; Reduced-pin-count automatic
                 test equipment; sensitive scan design; Signal
                 input/output pin counts; signal input/output pin
                 counts; testing",
  thesaurus =    "Application specific integrated circuits; Integrated
                 circuit testing; Logic design",
  treatment =    "P Practical",
}

@Article{Starke:1990:DTD,
  author =       "Cordt W. Starke",
  title =        "Design for testability and diagnosis in a {VLSI CMOS
                 System\slash 370} processor",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "355--362",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Describes the design for testability and diagnosis in
                 an IBM System/370 processor based on VLSI CMOS
                 technology. The design incorporates built-in
                 pseudorandom-pattern self-test and the boundary-scan
                 technique. This technique permits the migration of
                 tests generated for component-level to higher-level
                 packages such as printed circuit boards and the system.
                 Consequently, the expense for testing of higher-level
                 packages can be reduced, and the test equipment for the
                 processor can be simplified. The design also offers
                 economical diagnostic capability.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Boeblingen, West Germany",
  classcodes =   "B2570D (CMOS integrated circuits); B1130B
                 (Computer-aided circuit analysis and design); B0170E
                 (Production facilities and engineering); C7410D
                 (Electronic engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B1130B (Computer-aided circuit analysis and design);
                 B2570D (CMOS integrated circuits); C7410D (Electronic
                 engineering)",
  corpsource =   "IBM Data Syst. Div., Boeblingen, West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic testing; Boundary-scan; boundary-scan;
                 built-in pseudorandom-; Built-in pseudorandom-pattern
                 self-test; circuit layout CAD; circuits; CMOS
                 integrated; Component-level; component-level; Design
                 for diagnosis; design for diagnosis; Design for
                 testability; design for testability; Economical
                 diagnostic capability; economical diagnostic
                 capability; higher-; Higher-level packages; IBM
                 computers; IBM System/370; IBM System/370 processor;
                 integrated circuit testing; level packages; pattern
                 self-test; Printed circuit boards; printed circuit
                 boards; processor; Test equipment; test equipment;
                 VLSI; VLSI CMOS technology",
  thesaurus =    "Automatic testing; Circuit layout CAD; CMOS integrated
                 circuits; IBM computers; Integrated circuit testing;
                 VLSI",
  treatment =    "P Practical",
}

@Article{Daehn:1990:AEL,
  author =       "W. Daehn and T. W. Williams and K. D. Wagner",
  title =        "Aliasing errors in linear automata used as
                 multiple-input signature analyzers",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "363--380 (or 363--379??)",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "94A29",
  MRnumber =     "92b:94027",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Deals with the aliasing probability of multiple-input
                 data compressors used in self-testing networks. It is
                 shown that a far more general class of linear machines
                 than linear feedback shift registers can be used for
                 data compression purposes. The function of these
                 machines is modeled by a Markov process. The
                 steady-state value of the aliasing probability is shown
                 to be the same as for single-input signature analysis
                 registers. An easily verifiable criterion is given that
                 allows one to decide whether a given linear machine
                 falls into this class of multiple-input data
                 compressors. The steady-state value of the aliasing
                 probability is shown to be independent of the
                 correlation of the data streams at the inputs of the
                 data compressor. Two kinds of circuits are analyzed in
                 more detail with respect to their aliasing properties:
                 linear feedback shift registers with multiple inputs,
                 and linear cellular automata. Simulation results show
                 the effect of the next-state function on the
                 steady-state value of the aliasing probability and the
                 effect of correlation on the transient response.",
  acknowledgement = ack-nhfb,
  affiliation =  "Hannover Univ., West Germany",
  classcodes =   "B1265B (Logic circuits); B0240Z (Other and
                 miscellaneous); B0290H (Linear algebra); C5210 (Logic
                 design methods); C4220 (Automata theory); C1140Z (Other
                 and miscellaneous); C4140 (Linear algebra)",
  classification = "B0240Z (Other and miscellaneous); B0290H (Linear
                 algebra); B1265B (Logic circuits); C1140Z (Other and
                 miscellaneous); C4140 (Linear algebra); C4220 (Automata
                 theory); C5210 (Logic design methods)",
  corpsource =   "Hannover Univ., West Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebra; Aliasing errors; aliasing errors; Aliasing
                 probability; aliasing probability; Data compression;
                 data compression; finite automata; Linear cellular
                 automata; linear cellular automata; linear feedback
                 shift; Linear feedback shift registers; Linear
                 machines; linear machines; logic testing; Markov
                 process; Markov processes; matrix; Multiple-input data
                 compressors; multiple-input data compressors;
                 Multiple-input signature analyzers; multiple-input
                 signature analyzers; Next-state function; next-state
                 function; probability; registers; self-; Self-testing
                 networks; steady-state; Steady-state value; testing
                 networks; Transient response; transient response;
                 value",
  reviewer =     "Zhen Hua Wang",
  thesaurus =    "Finite automata; Logic testing; Markov processes;
                 Matrix algebra; Probability",
  treatment =    "P Practical; T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Savir:1990:ICA,
  author =       "J. Savir",
  title =        "Improved cutting algorithm",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "381--388",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The cutting algorithm allows computation of bounds on
                 signal probabilities and detection probabilities in
                 combinational networks. These bounds can be used to
                 determine the necessary pseudorandom test length needed
                 to test a network. One of the problems with the cutting
                 algorithm is that it may compute loose bounds which
                 translate into unnecessarily long test lengths. The
                 object of this paper is to improve the cutting
                 algorithm so that the computed bounds become
                 satisfactory. The improved cutting algorithm is a
                 careful combination of the original cutting algorithm
                 and the Parker-McCluskey algorithm. The tightness of
                 the computed bounds may vary depending on which portion
                 of the circuit is handled with the cutting algorithm
                 and which with the Parker-McCluskey algorithm. Thus,
                 the user of the improved cutting algorithm can actually
                 control and trade off the accuracy of the results
                 against the computational effort needed to achieve
                 them.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C4230B (Combinatorial switching
                 theory); C5120 (Logic and switching circuits); C7410D
                 (Electronic engineering)",
  classification = "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C4230B (Combinatorial switching
                 theory); C5120 (Logic and switching circuits); C7410D
                 (Electronic engineering)",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic testing; BIST; bounds; Combinational
                 networks; combinational networks; combinatorial
                 circuits; computed; Computed bounds; Cutting algorithm;
                 cutting algorithm; detection; Detection probabilities;
                 length; logic testing; Parker-McCluskey algorithm;
                 probabilities; probability; pseudorandom test;
                 Pseudorandom test length; Signal probabilities; signal
                 probabilities; Tightness; tightness",
  thesaurus =    "Automatic testing; Combinatorial circuits; Logic
                 testing; Probability",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Hortensius:1990:CAC,
  author =       "P. D. Hortensius and R. D. McLeod and B. W. Podaima",
  title =        "Cellular automata circuits for built-in self-test",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "389--405",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Results are presented for a variation on a built-in
                 self-test (BIST) technique based upon a distributed
                 pseudorandom number generator derived from a
                 one-dimensional cellular automata array. These cellular
                 automata logic block observation circuits provide an
                 alternative to conventional design for testability
                 circuitry. The issue of generating probabilistically
                 weighted test patterns for use in built-in self-test is
                 also addressed. The methodology presented considers the
                 suitability of incorporating structures based on
                 cellular automata, a strategy which, in general,
                 improves test pattern quality. Thus, these structures
                 qualify as attractive candidates for use in weighted
                 test pattern generator design. The analysis involved in
                 determining and statistically evaluating these
                 potential models is discussed, and is compared with
                 that for previous as well as statistically independent
                 models. Relevant signature analysis properties for
                 elementary one-dimensional cellular automata are also
                 discussed. It is found that cellular automata with
                 cyclic-group rules provide signature analysis
                 properties comparable to those of the linear feedback
                 shift register. The results presented are based upon
                 simulation.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of IBM Res., Thomas J Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  classcodes =   "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5120 (Logic and switching
                 circuits); C7410D (Electronic engineering); C4220
                 (Automata theory)",
  classification = "B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C4220 (Automata theory); C5120
                 (Logic and switching circuits); C7410D (Electronic
                 engineering)",
  corpsource =   "Div. of IBM Res., Thomas J Watson Res. Centre,
                 Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automata; automata logic block observation circuits;
                 automatic testing; Built-in self-test; built-in
                 self-test; cellular; cellular arrays; Cellular automata
                 logic block observation circuits; circuitry;
                 Cyclic-group rules; cyclic-group rules; distributed
                 pseudorandom number; Distributed pseudorandom number
                 generator; finite automata; generator; integrated
                 circuit testing; one-dimensional cellular;
                 One-dimensional cellular automata; One-dimensional
                 cellular automata array; one-dimensional cellular
                 automata array; Probabilistically weighted test
                 patterns; probabilistically weighted test patterns;
                 Signature analysis properties; signature analysis
                 properties; Simulation; simulation; testability;
                 Testability circuitry",
  thesaurus =    "Automatic testing; Cellular arrays; Finite automata;
                 Integrated circuit testing",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Keller:1990:BSS,
  author =       "B. L. Keller and T. J. Snethen",
  title =        "Built-in self-test support in the {IBM Engineering
                 Design System}",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "406--415",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "To evaluate the effectiveness of built-in self-test
                 (BIST) for logic circuits, the test design automation
                 group within the IBM Engineering Design System (EDS)
                 has developed tools to support BIST. The paper is an
                 overview of that support. The specific hardware
                 approaches taken are described briefly, and a short
                 description is given of the major tools that have been
                 developed and the methodology for using them. The
                 performance of the system is shown for two sample
                 circuits.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Endicott, NY, USA",
  classcodes =   "B1265B (Logic circuits); C5210 (Logic design
                 methods)",
  classification = "B1265B (Logic circuits); C5210 (Logic design
                 methods)",
  corpsource =   "IBM Data Syst. Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic testing; Built-in self-test; built-in
                 self-test; circuits; IBM computers; IBM Engineering
                 Design System; logic; Logic circuits; logic testing;
                 Performance; performance; Test design automation group;
                 test design automation group; Tools; tools",
  thesaurus =    "Automatic testing; IBM computers; Logic testing",
  treatment =    "P Practical",
}

@Article{Oakland:1990:SAC,
  author =       "S. F. Oakland and J. L. Corr and J. D. Blair and R. D.
                 Norman and W. J. DeGuise",
  title =        "Self-testing the {16-Mbps} adapter chip for the {IBM}
                 token-ring local area network",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "416--427",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Describes the boundary-scan and built-in self-test
                 (BIST) functions of the IBM token-ring local area
                 network (LAN) adapter chip. These functions present a
                 number of unique features. First, less than 1\% of
                 available standard cell circuits were needed to
                 implement these functions. Second, clocking methods
                 used in different logical macros were merged into a
                 comprehensive clocking sequence for self-test. Finally,
                 asynchronous serial and parallel interfaces were
                 provided to facilitate the communication between a test
                 system and the chip's built-in test circuits. Although
                 self-test and boundary-scan provide for an inexpensive
                 higher-level package test, evaluation showed that
                 automatically generated deterministic patterns provide
                 a better-quality VLSI chip manufacturing test.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B6210L (Computer communications); B2570D (CMOS
                 integrated circuits); B1265Z (Other digital circuits);
                 C5620L (Local area networks)",
  classification = "B1265Z (Other digital circuits); B2570D (CMOS
                 integrated circuits); B6210L (Computer communications);
                 C5620L (Local area networks)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "16 Mbit/s; 16-Mbps adapter chip; asynchronous
                 parallel; Asynchronous parallel interface; Asynchronous
                 serial interface; asynchronous serial interface;
                 automatic testing; Automatically generated
                 deterministic patterns; automatically generated
                 deterministic patterns; Boundary scan function;
                 boundary scan function; Built-in self-test function;
                 built-in self-test function; Built-in test circuits;
                 built-in test circuits; Clocking methods; clocking
                 methods; Clocking sequence; clocking sequence; CMOS
                 integrated circuits; digital; IBM computers; IBM
                 token-ring local area; IBM token-ring local area
                 network; integrated circuit; integrated circuits;
                 interface; logical; Logical macros; macros;
                 manufacturing test; network; Standard cell circuits;
                 standard cell circuits; testing; token networks; VLSI
                 chip; VLSI chip manufacturing test",
  numericalindex = "Bit rate 1.6E+07 bit/s",
  thesaurus =    "Automatic testing; CMOS integrated circuits; Digital
                 integrated circuits; IBM computers; Integrated circuit
                 testing; Token networks",
  treatment =    "P Practical",
}

@Article{VanHorn:1990:LIC,
  author =       "J. J. {Van Horn} and R. A. Waller and R. J. Prilik and
                 K. C. Bocash",
  title =        "{LAN} interface chip and mixed-signal testing
                 developments",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "428--441",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Describes the local area network semiconductor chip,
                 from early development through volume manufacturing
                 production, highlighting the testing achievements
                 associated with its qualification and release to
                 production. The paper deals with laboratory development
                 and production in manufacturing. It describes the
                 importance of partitioning via latch-based boundaries,
                 and how it reduced development cycle time by allowing
                 independent debug and diagnostic tests. The development
                 of tests to characterize the phase-lock loop at
                 application conditions and the evolution of these tests
                 into efficient production test vehicles are discussed.
                 Techniques are described that provide new approaches to
                 analog testing, focusing on adapting a production
                 digital tester to meet the characterization and
                 production requirements of a very sensitive
                 PLL/receiver/transmitter analog design. The discussion
                 on manufacturing is centered around three areas, wafer
                 testing, yield learning, and reliability. Unique
                 concepts in each area are presented, along with
                 detailed descriptions of specific applications.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B6210L (Computer communications); B2570D (CMOS
                 integrated circuits); B0170E (Production facilities and
                 engineering); C5620L (Local area networks)",
  classification = "B0170E (Production facilities and engineering);
                 B2570D (CMOS integrated circuits); B6210L (Computer
                 communications); C5620L (Local area networks)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analog testing; analog testing; Application
                 conditions; application conditions; area networks;
                 boundaries; CMOS integrated circuits; Independent debug
                 tests; independent debug tests; Independent diagnostic
                 tests; independent diagnostic tests; integrated circuit
                 testing; interface chip; Laboratory development;
                 laboratory development; LAN; LAN interface chip;
                 latch-based; Latch-based boundaries; local; local area
                 network; Local area network semiconductor chip;
                 Mixed-signal testing; mixed-signal testing;
                 Partitioning; partitioning; Phase-lock loop; phase-lock
                 loop; production digital; Production digital tester;
                 Production test vehicles; production test vehicles;
                 Reliability; reliability; semiconductor chip; tester;
                 Volume manufacturing production; volume manufacturing
                 production; Wafer testing; wafer testing; Yield
                 learning; yield learning",
  thesaurus =    "CMOS integrated circuits; Integrated circuit testing;
                 Local area networks",
  treatment =    "P Practical",
}

@Article{Anonymous:1990:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "2/3",
  pages =        "442--448",
  month =        mar # "\slash " # may,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:11:49 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sai-Halasz:1990:ETP,
  author =       "G. A. Sai-Halasz and M. R. Wordeman and D. P. Kern and
                 S. A. Rishton and E. Ganin and T. H. P. Chang and R. H.
                 Dennard",
  title =        "Experimental technology and performance of
                 0.1-$\mu$m-gate-length {FETs} operated at
                 liquid-nitrogen temperature",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "452--465",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An overview is presented of work to explore the
                 extendibility of the silicon FET technology to the
                 0.1-$\mu$m-gate length level. Self-aligned, n-channel,
                 polysilicon-gated FETs were designed for operation at
                 77 K, with reduced power-supply voltage. Direct-write
                 electron-beam lithography was used to pattern all
                 levels, while other processing followed established
                 lines. Noteworthy results of the work included the
                 observation of a clear manifestation of velocity
                 overshoot, which contributed to achieving extrinsic
                 transconductances above 940$\mu$S/$\mu$m at 0.07-$\mu$m
                 gate length. The measured switching delay of ring
                 oscillators which contained 0.1-$\mu$m-gate-length
                 devices was as low as 13.1 ps, with simulations showing
                 potential for reduction to below 5 ps. Both the
                 transconductance and the switching times are the best
                 values observed for FETs to date-indicating continuing
                 value in the scaling of FETs to dimensions well beyond
                 those currently used.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2560S (Other field effect devices); B2550
                 (Semiconductor device technology)",
  classification = "B2550 (Semiconductor device technology); B2560S
                 (Other field effect devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.1 micron; 0.1 Micron; 77 K; direct-write
                 electron-beam lithography; Direct-write electron-beam
                 lithography; electron beam lithography; extrinsic
                 transconductances; Extrinsic transconductances; FET
                 technology; field effect transistors; gate length; Gate
                 length; overshoot; polysilicon-gated FETs;
                 Polysilicon-gated FETs; power-supply voltage;
                 Power-supply voltage; ring oscillators; Ring
                 oscillators; scaling; Scaling; semiconductor
                 technology; switching delay; Switching delay; velocity;
                 Velocity overshoot",
  numericalindex = "Size 1.0E-07 m; Temperature 7.7E+01 K",
  thesaurus =    "Electron beam lithography; Field effect transistors;
                 Semiconductor technology",
  treatment =    "X Experimental",
}

@Article{Laux:1990:MCA,
  author =       "S. E. Laux and M. V. Fischetti and D. J. Frank",
  title =        "{Monte Carlo} analysis of semiconductor devices: The
                 {DAMOCLES} program",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "466--494",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The behavior of small semiconductor devices is
                 simulated using an advanced Monte Carlo carrier
                 transport model. The model improves upon the state of
                 the art by including the full band structure of the
                 semiconductor, by using scattering rates computed
                 consistently with the band structure, and by accounting
                 for both long-and short-range interactions between
                 carriers. It is sufficiently flexible to describe both
                 unipolar and bipolar device operation, for a variety of
                 semiconductor materials and device structures. Various
                 results obtained with the associated DAMOCLES program
                 for n- and p-channel Si MOSFETs, GaAs MESFETs, and Si
                 bipolar junction transistors are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si/int Si/el; GaAs/int As/int Ga/int GaAs/bin As/bin
                 Ga/bin",
  classcodes =   "B2560B (Modelling and equivalent circuits); B2560S
                 (Other field effect devices); B2560R (Insulated gate
                 field effect transistors); B2560J (Bipolar
                 transistors); C7410D (Electronic engineering)",
  classification = "B2560B (Modelling and equivalent circuits); B2560J
                 (Bipolar transistors); B2560R (Insulated gate field
                 effect transistors); B2560S (Other field effect
                 devices); C7410D (Electronic engineering)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar device; Bipolar device operation; bipolar
                 junction transistors; Bipolar junction transistors;
                 bipolar transistors; carrier transport model; Carrier
                 transport model; DAMOCLES; DAMOCLES program; digital
                 simulation; field effect transistors; full band
                 structure; Full band structure; GaAs; insulated gate;
                 MESFETs; Monte Carlo analysis; Monte Carlo methods;
                 MOSFETs; operation; program; scattering rates;
                 Scattering rates; Schottky gate; semiconductor device
                 models; semiconductor devices; Semiconductor devices;
                 semiconductor materials; Semiconductor materials;
                 short-range interactions; Short-range interactions;
                 Si",
  thesaurus =    "Bipolar transistors; Digital simulation; Insulated
                 gate field effect transistors; Monte Carlo methods;
                 Schottky gate field effect transistors; Semiconductor
                 device models",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Jackson:1990:SGM,
  author =       "T. N. Jackson and B. J. {Van Zeghbroeck} and G. Pepper
                 and J. F. DeGelormo and T. Keuch and H. Meier and P.
                 Wolf",
  title =        "Submicron-gate-length {GaAs MESFETs}",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "495--505",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "It is well known that reducing gate length is a
                 powerful means of increasing the transconductance and
                 transit frequency of GaAs MESFET devices. However, by
                 reducing the gate length without scaling channel doping
                 and thickness, the performance obtained is limited by
                 short-channel effects and parasitics. This paper
                 presents an overview of work on two different MESFET
                 structures, illustrating how device performance can be
                 increased by decreasing the gate length, with the
                 result that appropriately scaled MESFETs compare
                 favorably with GaAs-AlGaAs heterojunction FETs. Recent
                 results on 0.15-$\mu$m-gate-length
                 implantation-self-aligned MESFETs suggest that it
                 should be possible to increase the speed of high-speed
                 GaAs MESFET (logic, analog, and microwave) circuits
                 through the use of devices having gate lengths less
                 than 0.5$\mu$m.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
  classcodes =   "B2560S (Other field effect devices)",
  classification = "B2560S (Other field effect devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "channel doping; Channel doping; effect transistors;
                 effects; frequency; GaAs; gallium arsenide; gate
                 length; Gate length; III-V semiconductors;
                 implantation-self-aligned MESFETs;
                 Implantation-self-aligned MESFETs; MESFET devices;
                 parasitics; Parasitics; Schottky gate field;
                 semiconductor doping; short-channel; Short-channel
                 effects; transconductance; Transconductance; transit;
                 Transit frequency",
  thesaurus =    "Gallium arsenide; III-V semiconductors; Schottky gate
                 field effect transistors; Semiconductor doping",
  treatment =    "P Practical; X Experimental",
}

@Article{Keihl:1990:HFI,
  author =       "R. A. Keihl and P. M. Solomon and D. J. Frank",
  title =        "Heterojunction {FETs} in {III-V} compounds",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "506--529",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Reviews work on heterojunction FETs (HFETs) fabricated
                 from III-V compounds, with emphasis on the unique
                 properties of such devices and their applicability to
                 high-speed logic circuits. After discussing their
                 general properties, including their uniquely high
                 carrier mobility and fast switching speed, the authors
                 discuss HFETs investigated at the IBM Thomas J. Watson
                 Research Center, i.e., the
                 semiconductor-insulator-semiconductor FET (SISFET) and
                 quantum-well metal-insulator-semiconductor FET
                 (QW-MISFET)-and their possible circuit applications.
                 Finally, the opportunities for achieving a circuit
                 performance level beyond that offered by the
                 GaAs-(Al,Ga)As materials system are explored.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2560R (Insulated gate field effect transistors);
                 B2520D (II- VI and III-V semiconductors)",
  classification = "B2520D (II-VI and III-V semiconductors); B2560R
                 (Insulated gate field effect transistors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "carrier; carrier mobility; Carrier mobility; circuit;
                 Circuit performance level; effect transistors; FETs;
                 heterojunction; Heterojunction FETs; HFETs; high-speed
                 logic circuits; High-speed logic circuits; III-V
                 compounds; III-V semiconductors; insulated gate field;
                 logic devices; mobility; performance level;
                 quantum-well metal-insulator-semiconductor FET;
                 Quantum-well metal-insulator-semiconductor FET;
                 QW-MISFET; semiconductor-insulator-semiconductor FET;
                 Semiconductor-insulator-semiconductor FET; SISFET",
  thesaurus =    "Carrier mobility; III-V semiconductors; Insulated gate
                 field effect transistors; Logic devices",
  treatment =    "A Application; P Practical",
}

@Article{Heiblum:1990:BHT,
  author =       "M. Heiblum and M. V. Fischetti",
  title =        "Ballistic hot-electron transistors",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "530--549",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Presents an overview of work at the IBM Thomas J.
                 Watson Research Center on the tunneling hot-electron
                 transfer amplifier (THETA) device-including its use as
                 an amplifier and as a tool for investigating ballistic
                 hot-electron transport. In the initial, vertically
                 configured version of the device, a
                 quasi-monoenergetic, variable-energy, hot-electron beam
                 is generated (via tunneling) which traverses a thin
                 GaAs region and is then collected and energy-analyzed.
                 As the hot electrons traverse the device, they are used
                 to probe scattering events, band nonparabolicity,
                 size-quantization effects, and intervalley transfer. A
                 recent, lateral version of the device has been used to
                 demonstrate the existence of ballistic hot-electron
                 transport in the plane of a two-dimensional electron
                 gas, and the associated possibility of achieving high
                 gain.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
  classcodes =   "B2560J (Bipolar transistors)",
  classification = "B2560J (Bipolar transistors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ballistic hot-; Ballistic hot-electron transport; Band
                 nonparabolicity; band nonparabolicity; bipolar
                 transistors; electron beam; electron gas; electron
                 transport; GaAs; gain; Gain; gallium arsenide; hot
                 electron; hot-; Hot-electron beam; III-V
                 semiconductors; intervalley transfer; Intervalley
                 transfer; quantization effects; Scattering events;
                 scattering events; size-; Size-quantization effects;
                 transistors; Tunneling hot-electron transfer amplifier;
                 tunneling hot-electron transfer amplifier;
                 two-dimensional; Two-dimensional electron gas;
                 vertically configured version; Vertically configured
                 version",
  thesaurus =    "Bipolar transistors; Gallium arsenide; Hot electron
                 transistors; III-V semiconductors",
  treatment =    "P Practical; X Experimental",
}

@Article{Tiwari:1990:CSH,
  author =       "S. Tiwari and S. L. Wright and D. J. Frank",
  title =        "Compound semiconductor heterostructure bipolar
                 transistors",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "550--567",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Presents an overview of our work on the technology,
                 material and electronic properties, and performance
                 limitations of compound semiconductor heterostructure
                 bipolar transistors. Graded-gap epitaxial n-type ohmic
                 contacts and p-type shallow diffusion ohmic contacts
                 are important in the fabrication of high-performance
                 (Al,Ga)As/GaAs devices. In the device structure
                 implemented, the presence of a wide-gap p-type
                 (Al,Ga)As extrinsic base region at the surface
                 suppresses surface recombination, thereby enhancing the
                 current gain at small device dimensions. The authors
                 discuss experimental and theoretical results concerning
                 the limiting physical effects due to heterostructure
                 design and intrinsic and extrinsic bulk phenomena of
                 compound semiconductors, emphasizing the understanding
                 developed and the discoveries made. As device speeds
                 have increased with coordinated scaling, dispersive
                 effects have become increasingly important. The authors
                 show how these may be included by modifying the
                 conventional quasi-static modeling of the bipolar
                 transistor, in order to obtain a realistic simulation
                 of fast switching transients. Finally, they discuss
                 scaling of heterostructure bipolar transistors, and
                 implications of the use of lower-bandgap materials and
                 operation at cryogenic temperatures.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "AlGaAs-GaAs/int AlGaAs/int GaAs/int Al/int As/int
                 Ga/int AlGaAs/ss Al/ss As/ss Ga/ss GaAs/bin As/bin
                 Ga/bin",
  classcodes =   "B2560J (Bipolar transistors); B2520D (II-VI and III-V
                 semiconductors); B2560B (Modelling and equivalent
                 circuits)",
  classification = "B2520D (II-VI and III-V semiconductors); B2560B
                 (Modelling and equivalent circuits); B2560J (Bipolar
                 transistors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AlGaAs-GaAs devices; aluminium compounds; bipolar
                 transistors; bulk phenomena; Bulk phenomena; compound;
                 Compound semiconductor heterostructure bipolar
                 transistors; contacts; coordinated scaling; Coordinated
                 scaling; cryogenic; Cryogenic temperatures; current
                 gain; Current gain; design; device speeds; Device
                 speeds; dispersive effects; Dispersive effects;
                 electronic properties; Electronic properties;
                 epitaxial; Epitaxial n-type ohmic contacts; extrinsic
                 base region; Extrinsic base region; fast switching;
                 Fast switching transients; gallium arsenide;
                 heterojunction; heterostructure; Heterostructure
                 design; III-V semiconductors; limiting physical
                 effects; Limiting physical effects; lower-bandgap
                 materials; Lower-bandgap materials; n-type ohmic
                 contacts; ohmic contacts; p-type shallow diffusion
                 ohmic; P-type shallow diffusion ohmic contacts;
                 quasi-static modeling; Quasi-static modeling; scaling;
                 Scaling; semiconductor device models; semiconductor
                 heterostructure bipolar transistors; surface
                 recombination; Surface recombination; temperatures;
                 transients",
  thesaurus =    "Aluminium compounds; Gallium arsenide; Heterojunction
                 bipolar transistors; III-V semiconductors; Ohmic
                 contacts; Semiconductor device models",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Harder:1990:HGA,
  author =       "Ch. S. Harder and B. J. {Van Zeghbroeck} and M. P.
                 Kesler and H. P. Meier and P. Vettiger and D. J. Webb
                 and P. Wolf",
  title =        "High-speed {GaAs\slash AlGaAs} optoelectronic devices
                 for computer applications",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "568--584",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Presents an overview of low-threshold GaAs/AlGaAs
                 quantum-well laser diodes and GaAs
                 metal-semiconductor-metal photodetectors-two
                 optoelectronic devices which show good promise for use
                 in computer-related communication. Present-day
                 telecommunication device technology (based on InP
                 materials) is not well suited to the requirements of
                 optical data communication among and within computers
                 because the computer environment is much more
                 demanding. It imposes a higher ambient temperature on
                 the devices, and requires denser packaging and smaller
                 power dissipation per device, as well as a high degree
                 of parallelism. The GaAs/AlGaAs device technology is
                 ideally suited to this task because of the possibility
                 of integration of arrays of high-speed, low-threshold
                 laser diodes and high-speed photodetectors with
                 high-performance electronic circuits.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab., Switzerland",
  chemicalindex = "GaAs-AlGaAs/int AlGaAs/int GaAs/int Al/int As/int
                 Ga/int AlGaAs/ss Al/ss As/ss Ga/ss GaAs/bin As/bin
                 Ga/bin; GaAs/int As/int Ga/int GaAs/bin As/bin Ga/bin",
  classcodes =   "B4270 (Integrated optoelectronics); B6260 (Optical
                 links and equipment); B4320J (Semiconductor junction
                 lasers); C5690 (Other data communication equipment and
                 techniques); C5610S (System buses)",
  classification = "B4270 (Integrated optoelectronics); B4320J
                 (Semiconductor junction lasers); B6260 (Optical links
                 and equipment); C5610S (System buses); C5690 (Other
                 data communication equipment and techniques)",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AlGaAs; aluminium compounds; ambient temperature;
                 Ambient temperature; computer interfaces;
                 Computer-related communication; computer-related
                 communication; data communication; denser packaging;
                 Denser packaging; equipment; GaAs; GaAs-; GaAs-AlGaAs;
                 gallium arsenide; high-performance electronic circuits;
                 High-performance electronic circuits; III-V
                 semiconductors; integrated optoelectronics; metal-;
                 Metal-semiconductor-metal photodetectors; optical
                 communication equipment; Optical data communication;
                 optical data communication; Optoelectronic devices;
                 optoelectronic devices; Parallelism; parallelism;
                 photodetectors; power dissipation; Power dissipation;
                 Quantum-well laser diodes; quantum-well laser diodes;
                 semiconductor junction lasers; semiconductor-metal
                 photodetectors",
  thesaurus =    "Aluminium compounds; Computer interfaces; Data
                 communication equipment; Gallium arsenide; III-V
                 semiconductors; Integrated optoelectronics; Optical
                 communication equipment; Photodetectors; Semiconductor
                 junction lasers",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Rubin:1990:EAM,
  author =       "B. J. Rubin",
  title =        "An electromagnetic approach for modeling
                 high-performance computer packages",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "585--600",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Described here is an electromagnetic approach for the
                 analysis of high-performance computer packages such as
                 the thermal conduction module (TCM) used in the IBM
                 3080 and 3090 processor units. Modeling of signal paths
                 and limitations of previous methods are discussed.
                 Numerical results are presented for propagation
                 characteristics associated with signal lines and vias,
                 and for coupled noise between signal lines. The results
                 are compared with those obtained by means of test
                 vehicles, scale models, and capacitance calculations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B0170J (Product packaging); B2210 (Printed circuits);
                 C5420 (Mainframes and minicomputers); C5150 (Other
                 circuits for digital computers); C5490 (Other
                 aspects)",
  classification = "B0170J (Product packaging); B2210 (Printed
                 circuits); C5150 (Other circuits for digital
                 computers); C5420 (Mainframes and minicomputers); C5490
                 (Other aspects)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "capacitance calculations; Capacitance calculations;
                 cooling; coupled; Coupled noise; digital computers; EM
                 analysis; high-performance computer packages;
                 High-performance computer packages; IBM 3080; IBM 3090;
                 IBM computers; mainframes; modules; noise; packaging;
                 propagation characteristics; Propagation
                 characteristics; scale models; Scale models; signal
                 lines; Signal lines; signal paths; Signal paths; test
                 vehicles; Test vehicles; thermal conduction module;
                 Thermal conduction module; vias; Vias",
  thesaurus =    "Cooling; Digital computers; IBM computers; Mainframes;
                 Modules; Packaging",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Deutsch:1990:HSP,
  author =       "A. Deutsch and G. V. Kopcsay and V. A. Ranieri and J.
                 K. Cataldo and E. A. Galligan and W. S. Graham and R.
                 P. McGuouey and S. L. Nunes and J. R. Paraszczak and J.
                 J. Ritsko and R. J. Serino and D. Y. Shih and J. S.
                 Wilczynski",
  title =        "High-speed signal propagation on lossy transmission
                 lines",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "4",
  pages =        "601--615",
  month =        jul,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Addresses some of the problems encountered in
                 propagating high-speed signals on lossy transmission
                 lines encountered in high-performance computers. A
                 technique is described for including
                 frequency-dependent losses, such as skin effect and
                 dielectric dispersion, in transmission line analyses.
                 The disjoint group of available tools is brought
                 together, and their relevance to the propagation of
                 high-speed pulses in digital circuit applications is
                 explained. Guidelines are given for different
                 interconnection technologies to indicate where the
                 onset of severe dispersion takes place. Experimental
                 structures have been built and tested, and this paper
                 reports on their electrical performance and
                 demonstrates the agreement between measured data and
                 waveforms derived from analysis. The paper addresses
                 the problems found on lossy lines, such as reflections,
                 rise-time slowdown, increased delay, attenuation, and
                 crosstalk, and suggests methods for controlling these
                 effects in order to maintain distortion-free
                 propagation of high-speed signals.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "B0170J (Product packaging); B5240 (Transmission line
                 theory); B2160 (Wires and cables); C5150 (Other
                 circuits for digital computers); C5490 (Other
                 aspects)",
  classification = "B0170J (Product packaging); B2160 (Wires and
                 cables); B5240 (Transmission line theory); C5150 (Other
                 circuits for digital computers); C5490 (Other
                 aspects)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; attenuation; Attenuation; crosstalk;
                 Crosstalk; delay; Delay; dielectric dispersion;
                 Dielectric dispersion; digital circuit; Digital circuit
                 applications; digital computers; digital signals;
                 dispersion; Dispersion; electrical performance;
                 Electrical performance; frequency-dependent;
                 Frequency-dependent losses; high-performance computers;
                 High-performance computers; high-speed; high-speed
                 pulses; High-speed pulses; High-speed signals;
                 interconnection technologies; Interconnection
                 technologies; line analyses; losses; lossy transmission
                 lines; Lossy transmission lines; packaging; rise-time
                 slowdown; Rise-time slowdown; signal propagation;
                 Signal propagation; signals; skin effect; Skin effect;
                 transmission; Transmission line analyses; transmission
                 lines; wiring",
  thesaurus =    "Crosstalk; Digital computers; Digital signals;
                 Packaging; Skin effect; Transmission lines; Wiring",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Wesley:1990:PCM,
  author =       "M. A. Wesley",
  title =        "Preface: Computer Modeling of Products and Processes",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "634--635",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Mantyla:1990:MST,
  author =       "M. Mantyla",
  title =        "A modeling system for top-down design of assembled
                 products",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "636--659",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The design of a mechanical product usually takes place
                 primarily in a top-down fashion, where the designer
                 first generates a rough, overall sketch of the product
                 and its main components. Later, the designer refines
                 the sketch to a detailed level while taking into
                 account the relevant requirements posed by strength,
                 cost, manufacturability, serviceability, and other
                 similar considerations. Current computer-aided design
                 (CAD) systems provide only limited support for this
                 kind of work. For instance, they cannot deal with
                 geometric or other information at varying levels of
                 detail, nor do they capture explicitly geometric
                 relationships among components intended to be joined
                 together in an assembly. This paper describes early
                 results of ongoing research on supporting top-down
                 design of mechanical products and discusses the major
                 requirements for CAD systems used for top-down design.
                 A prototype design system is described that provides
                 the following characteristics not usually found in
                 ordinary CAD systems: structuring of product
                 information in several layers, according to the stage
                 of the design process; representation of geometric
                 information about components at several levels of
                 detail; and representation and maintenance of geometric
                 relationships of components by means of a
                 constraint-satisfaction mechanism.",
  acknowledgement = ack-nhfb,
  affiliation =  "Helsinki Univ. of Technol., Espoo, Finland",
  classcodes =   "C7440 (Civil and mechanical engineering)",
  classification = "C7440 (Civil and mechanical engineering)",
  corpsource =   "Helsinki Univ. of Technol., Espoo, Finland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "assembled products; Assembled products; CAD;
                 computer-aided design; Computer-aided design;
                 constraint-satisfaction mechanism;
                 Constraint-satisfaction mechanism; cost; Cost;
                 geometric; Geometric relationships; manufacturability;
                 Manufacturability; mechanical engineering computing;
                 mechanical product; Mechanical product; modeling
                 system; Modeling system; product information; Product
                 information; prototype design system; Prototype design
                 system; relationships; serviceability; Serviceability;
                 strength; Strength; top-down design; Top-down design",
  thesaurus =    "CAD; Mechanical engineering computing",
  treatment =    "P Practical",
}

@Article{Deckert:1990:CDS,
  author =       "K. L. Deckert",
  title =        "Computer-aided design of slider bearings in magnetic
                 disk files",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "660--667",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Reviews the application of lubrication theory to
                 slider bearings in magnetic disk files. For more than
                 thirty years, slider bearings have been used to
                 maintain close and precise spacings between recording
                 transducer and recording medium in disk files. Computer
                 modeling has been central to the design and performance
                 analysis of these systems. The topics covered are the
                 basic design, sensitivity and tolerance analysis,
                 dynamic characteristics, and response to disk
                 excitations from the disk. The main purpose of this
                 paper is to review the use of computer modeling in
                 design of slider bearings; however, the discussion of
                 slider modes in the slider dynamics section is new.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Products Div., San Jose, CA, USA",
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media); C7440 (Civil and mechanical
                 engineering)",
  classification = "B3120B (Magnetic recording); C5320C (Storage on
                 moving magnetic media); C7440 (Civil and mechanical
                 engineering)",
  corpsource =   "IBM Gen. Products Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "CAD; disk; Disk excitations; dynamic characteristics;
                 Dynamic characteristics; excitations; lubrication
                 theory; Lubrication theory; magnetic disc storage;
                 magnetic disk files; Magnetic disk files; mechanical
                 engineering computing; recording medium; Recording
                 medium; recording transducer; Recording transducer;
                 sensitivity analysis; Sensitivity analysis; slider
                 bearings; Slider bearings; slider dynamics section;
                 Slider dynamics section; slider modes; Slider modes;
                 tolerance analysis; Tolerance analysis",
  thesaurus =    "CAD; Magnetic disc storage; Mechanical engineering
                 computing",
  treatment =    "P Practical",
}

@Article{Cooper:1990:DFA,
  author =       "E. S. Cooper",
  title =        "Disk file access-time constraints imposed by magnetic
                 air-bearing compliance",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "668--679",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Use is commonly made of coil voltages which produce
                 maximum acceleration and deceleration to wrest the
                 fastest access performance from the actuator of a disk
                 file. Alternatively, equivalent performance is easily
                 obtained with less control optimality by simply
                 increasing the coil voltage. A limit to greater coil
                 voltage, however, arises from the need to avoid harmful
                 effects when the servo loses control of the actuator,
                 the actuator slams into its crash stop, and the crash
                 force stresses the magnetic head air bearing. Magnetic
                 head air-bearing compliance, therefore, is one of three
                 fundamental constraints that limit the access-time
                 performance of an actuator. To obtain improved
                 access-time performance from a disk file, the following
                 should be optimized: the air-bearing slider, the
                 actuator crash stop, and the actuator mechanical time
                 constant. This paper presents relevant design
                 considerations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Products Div., San Jose, CA, USA",
  classcodes =   "C5320C (Storage on moving magnetic media)",
  classification = "C5320C (Storage on moving magnetic media)",
  corpsource =   "IBM Gen. Products Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acceleration; Acceleration; access performance; Access
                 performance; actuator; Actuator; actuator crash stop;
                 Actuator crash stop; actuator mechanical; Actuator
                 mechanical time constant; coil voltages; Coil voltages;
                 deceleration; Deceleration; disk file; Disk file;
                 electric actuators; magnetic air-bearing compliance;
                 Magnetic air-bearing compliance; magnetic disc storage;
                 servo; Servo; servomechanisms; time constant",
  thesaurus =    "Electric actuators; Magnetic disc storage;
                 Servomechanisms",
  treatment =    "P Practical",
}

@Article{Jones:1990:SFE,
  author =       "F. Jones and J. S. Logan",
  title =        "A simple finite element model for reactive
                 sputter-deposition systems",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "680--692",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The method of finite element analysis is used to
                 calculate oxygen-concentration profiles and
                 oxygen-absorption rates at the substrate and along the
                 shields in a RF magnetron reactive sputtering system
                 having a 12-inch-diameter magnetron. Results for
                 several shield arrangements are calculated as a
                 function of oxygen flow rate. The approach used assumes
                 the following: (i) the target is being sputtered in the
                 metallic state; (ii) the oxygen-concentration profile
                 in the system can be calculated from the diffusion
                 equation; (iii) the maximum amount of oxygen that can
                 be absorbed at any point in the system is proportional
                 to the metal deposition rate at that point; (iv) the
                 target absorbs no oxygen as long as it is in the
                 metallic state. The relative metal deposition rate
                 along the substrate and shields is calculated,
                 normalized to the measured deposition rate at the
                 substrate, and used as a boundary condition for the
                 diffusion equation. The calculated oxygen flow rate for
                 the formation of stoichiometric substrate films agrees
                 with experimental results to within 15\%. The critical
                 flow rate at which the target oxidizes, Q$_c$, is
                 measured experimentally and when used in the model
                 gives an oxygen partial pressure of about 0.31.10/sup
                 -6/ torr at the sputtering track.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "A8115C (Deposition by sputtering); B0520F (Vapour
                 deposition)",
  classification = "A8115C (Deposition by sputtering); B0520F (Vapour
                 deposition)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.31E-6; 0.31E-6 torr; boundary; Boundary condition;
                 condition; critical flow rate; Critical flow rate;
                 diffusion equation; Diffusion equation; films; finite
                 element analysis; finite element model; Finite element
                 model; magnetron; magnetrons; metal deposition rate;
                 Metal deposition rate; metallic; Metallic state; oxygen
                 flow rate; Oxygen flow rate; oxygen partial pressure;
                 Oxygen partial pressure; oxygen-absorption rates;
                 Oxygen-absorption rates; oxygen-concentration profiles;
                 Oxygen-concentration profiles; reactive
                 sputter-deposition systems; Reactive sputter-deposition
                 systems; RF; RF magnetron; shield arrangements; Shield
                 arrangements; sputter deposition; state; stoichiometric
                 substrate; Stoichiometric substrate films; torr",
  numericalindex = "Pressure 4.1E-05 Pa",
  thesaurus =    "Finite element analysis; Magnetrons; Sputter
                 deposition",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Dukovic:1990:CCD,
  author =       "J. O. Dukovic",
  title =        "Computation of current distribution in
                 electrodeposition, a review",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "693--705",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Reviews the research literature that has appeared
                 since 1980 on computer calculations of current
                 distribution in the field of electrodeposition. Key
                 contributions and general trends are identified, with
                 particular emphasis given to applications in the
                 electronics industry. The survey reveals how numerical
                 models have provided the technology of
                 electrodeposition with general understanding,
                 predictive power, and the capability of optimizing
                 deposit uniformity. Anticipated developments for the
                 nineties are discussed.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0520 (Thin film growth)",
  classification = "B0520 (Thin film growth)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer calculations; Computer calculations; current
                 distribution; Current distribution; deposit uniformity;
                 Deposit uniformity; electrodeposition;
                 Electrodeposition; electronics industry; Electronics
                 industry; numerical models; Numerical models; reviews",
  thesaurus =    "Current distribution; Electrodeposition; Reviews",
  treatment =    "G General Review; P Practical",
}

@Article{Young:1990:FEA,
  author =       "K. F. Young",
  title =        "Finite element analysis of planar stress anisotropy
                 and thermal behavior in thin films",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "706--717",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "To show the capability and diversity of finite element
                 analysis, the authors calculate three-dimensional
                 planar anisotropic stress distributions for various
                 thin-film geometries and materials in response to
                 thermal and electrical stimuli, for specific boundary
                 conditions. The simulated residual film stresses are
                 verified with acoustic microscopy measurements,
                 substrate flexure measurements, and the use of thermal
                 environment techniques. Simple shapes are analyzed as
                 building blocks for more complex structures. Effects of
                 nonlinear electrical resistance are also analyzed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Storage Syst. Products Div., San Jose, CA, USA",
  classcodes =   "A6860 (Physical properties of thin films,
                 nonelectronic); A0260 (Numerical approximation and
                 analysis)",
  classification = "A0260 (Numerical approximation and analysis); A6860
                 (Physical properties of thin films, nonelectronic)",
  corpsource =   "Storage Syst. Products Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acoustic microscopy; Acoustic microscopy measurements;
                 anisotropic stress distributions; Anisotropic stress
                 distributions; conditions; electrical stimuli;
                 Electrical stimuli; environment techniques; finite
                 element analysis; Finite element analysis; internal;
                 measurements; nonlinear electrical resistance;
                 Nonlinear electrical resistance; planar stress
                 anisotropy; Planar stress anisotropy; residual film
                 stresses; Residual film stresses; specific boundary;
                 Specific boundary conditions; stresses; substrate
                 flexure measurements; Substrate flexure measurements;
                 thermal; thermal behavior; Thermal behavior; Thermal
                 environment techniques; thermal stimuli; Thermal
                 stimuli; thermal stresses; thin-film geometries;
                 Thin-film geometries",
  thesaurus =    "Acoustic microscopy; Finite element analysis; Internal
                 stresses; Thermal stresses",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shareef:1990:TBX,
  author =       "I. A. Shareef and J. R. Maldonado and Y. Vladimirsky
                 and D. L. Katcoff",
  title =        "Thermoelastic behavior of {X-ray} lithography masks
                 during irradiation",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "718--735",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Presents computer calculations of thermoelastic
                 effects in X-ray lithography masks caused by the
                 absorption of X-rays during exposure. Several mask
                 structures are considered, with different substrate and
                 absorber materials, using finite element analysis. Part
                 I of the paper deals with short-pulse X-ray irradiation
                 (e.g. from gas plasma, laser-heated plasma, or
                 exploding wire sources), and Part II describes
                 irradiation during exposure with a
                 synchrotron-storage-ring X-ray source. For the
                 short-pulse irradiation, results indicate a maximum
                 rise in temperature on the mask of about 30 degrees C
                 for a 2-ns exposure with a 10-mJ/cm/sup 2/ X-ray pulse.
                 Mechanical static analysis shows that the maximum
                 stress in the absorber films, which is due to maximum
                 temperature differences in the mask layers, occurs at
                 the end of the pulse. The magnitude of the induced
                 thermoelastic stress is found comparable to the
                 intrinsic stress level of the mask materials (typically
                 2-5*10/sup 8/ dyn/cm/sup 2/). The analysis indicates
                 that when pulse amplitudes reach 10 mJ/cm/sup 2/, there
                 will be a need for experimental study of X-ray mask
                 distortion during exposure to short X-ray pulses. A
                 one-dimensional model is developed for the case of
                 storage-ring irradiation. The model predicts
                 distortions of the printed image due to a thermal wave
                 developed on the mask by scanning of the X-ray beam.
                 Experimental results are presented showing that the
                 effect is negligible under normal operating conditions
                 but may become noticeable for operation in vacuum or
                 without proper heat sinks.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B2550G (Lithography); C7410D (Electronic
                 engineering)",
  classification = "B2550G (Lithography); C7410D (Electronic
                 engineering)",
  corpsource =   "IBM Res. Div., Thomas J Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "distortion; electronic engineering computing;
                 exploding wire; Exploding wire sources; finite element
                 analysis; Finite element analysis; gas plasma; Gas
                 plasma; induced thermoelastic; Induced thermoelastic
                 stress; intrinsic stress level; Intrinsic stress level;
                 irradiation; laser-heated plasma; Laser-heated plasma;
                 mask; Mask distortion; Mask structures; masks; Masks;
                 maximum; Maximum stress; one-dimensional model;
                 One-dimensional model; operating conditions; Operating
                 conditions; pulse amplitudes; Pulse amplitudes;
                 scanning; Scanning; short-pulse X-ray; Short-pulse
                 X-ray irradiation; sources; stress; structures;
                 synchrotron radiation; synchrotron-storage-ring X-ray
                 source; Synchrotron-storage-ring X-ray source;
                 temperature differences; Temperature differences;
                 thermal stresses; thermal wave; Thermal wave;
                 thermoelastic effects; Thermoelastic effects;
                 thermoelasticity; X-ray lithography",
  thesaurus =    "Electronic engineering computing; Finite element
                 analysis; Masks; Synchrotron radiation; Thermal
                 stresses; Thermoelasticity; X-ray lithography",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Farouki:1990:PH,
  author =       "R. T. Farouki and T. Sakkalis",
  title =        "{Pythagorean} hodographs",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "736--752",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "65D17 (53A04)",
  MRnumber =     "92a:65063",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The hodograph of a plane parametric curve r(t)=(x(t),
                 y(t)) is the locus described by the first parametric
                 derivative r'(t)=(x'(t), y'(t)) of that curve. A
                 polynomial parametric curve is said to have a
                 Pythagorean hodograph if there exists a polynomial
                 sigma (t) such that x'/sup 2/(t)+y'/sup 2/(t) identical
                 to sigma /sup 2/(t), i.e. (x'(t), y'(t), sigma (t))
                 form a `Pythagorean triple'. Although
                 Pythagorean-hodograph curves have fewer degrees of
                 freedom than general polynomial curves of the same
                 degree, they exhibit remarkably attractive properties
                 for practical use. For example, their arc length is
                 expressible as a polynomial function of the parameter,
                 and their offsets are rational curves. The authors
                 present a sufficient-and-necessary algebraic
                 characterization of the Pythagorean-hodograph property,
                 analyze its geometric implications in terms of
                 Bernstein-Bezier forms, and survey the useful
                 attributes it entails in various applications.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  classcodes =   "B0290F (Interpolation and function approximation);
                 C4130 (Interpolation and function approximation)",
  classification = "B0290F (Interpolation and function approximation);
                 C4130 (Interpolation and function approximation)",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Arc length; arc length; Bernstein-Bezier forms; curve
                 fitting; hodograph property; parametric curve;
                 Parametric derivative; parametric derivative; plane
                 parametric curve; Plane parametric curve; polynomial;
                 Polynomial parametric curve; polynomials; Pythagorean-;
                 Pythagorean-hodograph property; rational curves;
                 Rational curves",
  thesaurus =    "Curve fitting; Polynomials",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Milenkovic:1990:FCC,
  author =       "V. J. Milenkovic and L. R. Nackman",
  title =        "Finding compact coordinate representations for
                 polygons and polyhedra",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "753--769",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Practical solid modeling systems are plagued by
                 numerical problems that arise from using floating-point
                 arithmetic. For example, polyhedral solids are often
                 represented by a combination of geometric and
                 combinatorial information. The geometric information
                 may consist of explicit plane equations, with
                 floating-point coefficients; the combinatorial
                 information may consist of face, edge, and vertex
                 adjacencies and orientations, with edges defined by
                 face-face adjacencies and vertices by edge-edge
                 adjacencies. Problems arise when numerical roundoff
                 error in geometric operations causes the geometric
                 information to become inconsistent with the
                 combinatorial information. These problems can be
                 avoided by using exact arithmetic instead of
                 floating-point arithmetic. However, some operations,
                 such as rotation, increase the number of bits required
                 to represent the plane equation coefficients. Since the
                 execution time of exact arithmetic operators increases
                 with the number of bits in the operands, the increased
                 number of bits in the plane equation coefficients can
                 cause performance problems. One proposed solution to
                 this performance problem is to round the plane equation
                 coefficients without altering the combinatorial
                 information. We show that such rounding is
                 NP-complete.",
  acknowledgement = ack-nhfb,
  affiliation =  "Harvard Univ., Cambridge, MA, USA",
  classcodes =   "C6130B (Graphics techniques)",
  classification = "C6130B (Graphics techniques)",
  corpsource =   "Harvard Univ., Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adjacencies; Adjacencies; combinatorial information;
                 Combinatorial information; compact coordinate
                 representations; Compact coordinate representations;
                 exact arithmetic; Exact arithmetic; execution time;
                 Execution time; explicit; Explicit plane equations;
                 floating-point arithmetic; Floating-point arithmetic;
                 geometric information; Geometric information;
                 NP-complete; numerical; Numerical roundoff error;
                 operands; Operands; orientations; Orientations; plane
                 equations; polygons; Polygons; polyhedra; Polyhedra;
                 roundoff error; roundoff errors; solid modeling
                 systems; Solid modeling systems; solid modelling",
  thesaurus =    "Roundoff errors; Solid modelling",
  treatment =    "P Practical",
}

@Article{Neff:1990:FDB,
  author =       "C. A. Neff",
  title =        "Finding the distance between two circles in
                 three-dimensional space",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "5",
  pages =        "770--775",
  month =        sep,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "51M25 (65D17 65Y25)",
  MRnumber =     "91i:51030",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper investigates, from an algebraic point of
                 view, the problem of finding the distance between two
                 circles located in R/sup 3/. It is shown, by combining
                 a theorem about solvable permutation groups and some
                 explicit calculations with a computer algebra system,
                 that, in general, the distance between two circles is
                 an algebraic function of the parameters defining them,
                 but that this function is not solvable in terms of
                 radicals. Although this result implies that one cannot
                 find a `closed-form' solution for the distance between
                 an arbitrary pair of circles in R/sup 3/, the author
                 discusses how such an algebraic quantity can still be
                 manipulated symbolically by combining standard
                 polynomial operations with an algorithm for isolating
                 the real roots of a polynomial in a convenient data
                 structure for real algebraic numbers. This data
                 structure and its operations have been implemented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  classcodes =   "C6130B (Graphics techniques); C6120 (File
                 organisation)",
  classification = "C6120 (File organisation); C6130B (Graphics
                 techniques)",
  corpsource =   "IBM Thomas J Watson Res. Center, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebraic; algebraic function; Algebraic function;
                 Algebraic quantity; arbitrary pair; Arbitrary pair;
                 CAD; circles; Circles; data structure; Data structure;
                 data structures; groups; polynomials; quantity; solid
                 modelling; solvable permutation; Solvable permutation
                 groups; standard polynomial operations; Standard
                 polynomial operations; three-dimensional space;
                 Three-dimensional space",
  thesaurus =    "CAD; Data structures; Polynomials; Solid modelling",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Kuech:1990:PTL,
  author =       "T. F. Kuech",
  title =        "Preface: Thin-Layer Formation",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "794--794",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:49 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Beach:1990:DLT,
  author =       "D. B. Beach",
  title =        "Design of low-temperature thermal chemical vapor
                 deposition processes",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "795--805",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The importance of an integrated approach involving
                 synthetic chemistry, physical chemistry, and chemical
                 engineering to the development of new thermal chemical
                 vapor deposition (CVD) processes for the production of
                 thin-film electronic materials is discussed. Particular
                 emphasis is placed on choosing precursor molecules with
                 facile thermal decomposition pathways that lead to pure
                 films at low temperatures. Two examples from the
                 author's laboratories, the deposition of copper from
                 trialkylphosphine cyclopentadienyl copper complexes and
                 the deposition of gallium nitride from diethylgallium
                 azide, are used to illustrate the principles of
                 precursor selection, the design factors for the
                 construction of thermal CVD reactors, and the selection
                 of processing conditions that optimize production of
                 the desired material. In addition, new work on the
                 thermal CVD of copper using an advanced reactor and
                 examples of selective copper deposition and conformal
                 copper deposition using the reactor are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cu/el; GaN/bin Ga/bin N/bin",
  classcodes =   "B2550 (Semiconductor device technology); B0520F
                 (Vapour deposition)",
  classification = "B0520F (Vapour deposition); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chemical vapour deposition; conformal deposition;
                 Conformal deposition; copper; Cu deposition;
                 decomposition pathways; deposition; design factors;
                 Design factors; diethylgallium azide; Diethylgallium
                 azide; electronic materials; gallium compounds; GaN
                 deposition; III-V; low temperature thermal CVD; Low
                 temperature thermal CVD; metallisation; precursor
                 molecules; Precursor molecules; process design; Process
                 design; processing conditions; Processing conditions;
                 production of thin-film; Production of thin-film
                 electronic materials; selective; Selective deposition;
                 semiconductor technology; semiconductor thin films;
                 semiconductors; thermal; thermal CVD; Thermal CVD;
                 Thermal decomposition pathways; trialkylphosphine
                 cyclopentadienyl; Trialkylphosphine cyclopentadienyl
                 copper",
  thesaurus =    "Chemical vapour deposition; Copper; Gallium compounds;
                 III-V semiconductors; Metallisation; Semiconductor
                 technology; Semiconductor thin films",
  treatment =    "N New Development; P Practical; X Experimental",
}

@Article{Meyerson:1990:LSS,
  author =       "B. S. Meyerson",
  title =        "Low-temperature {Si} and {Si:Ge} epitaxy by
                 ultrahigh-vacuum\slash chemical vapor deposition:
                 Process fundamentals",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "806--815",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Overview of work on the chemical and physical
                 considerations underlying the development of a
                 low-temperature chemical vapor deposition process,
                 designated ultrahigh-vacuum/chemical vapor deposition
                 (UHV/CVD). The origins of the rigorous vacuum and
                 chemical purity requirements of the process are
                 discussed. Operating in the range of 500 degrees C, the
                 process has made it possible to explore the use, in
                 silicon-based devices and atomic-length-scale
                 structures, of a number of metastable materials in the
                 Si:Ge:B system. Also discussed is associated
                 experimental work on the fabrication of high-speed
                 heterojunction bipolar transistors and high-mobility
                 two-dimensional hole-gas structures.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si:B/int Si/int B/int Si:B/bin Si/bin B/bin Si/el
                 B/el B/dop; Si:Ge/int Ge/int Si/int Si:Ge/bin Ge/bin
                 Si/bin Ge/el Si/el Ge/dop; Si/int Si/el",
  classcodes =   "B0510D (Epitaxial growth); B2550 (Semiconductor device
                 technology)",
  classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "atomic-length-scale structures; Atomic-length-scale
                 structures; chemical; Chemical purity requirements;
                 chemical vapor deposition; Chemical vapor deposition;
                 CVD; elemental semiconductors; germanium;
                 heterojunction bipolar transistors; Heterojunction
                 bipolar transistors; high-mobility two-dimensional
                 hole-gas structures; High-mobility two-dimensional
                 hole-gas structures; low temperature CVD; Low
                 temperature CVD; metastable materials; Metastable
                 materials; process fundamentals; Process fundamentals;
                 purity requirements; semiconductor doping;
                 semiconductor growth; Si; Si:B; Si:Ge; silicon; UHV;
                 vacuum requirements; Vacuum requirements; vapour phase
                 epitaxial growth; VPE",
  thesaurus =    "Elemental semiconductors; Germanium; Semiconductor
                 doping; Semiconductor growth; Silicon; Vapour phase
                 epitaxial growth",
  treatment =    "X Experimental",
}

@Article{Ginsberg:1990:SEG,
  author =       "B. J. Ginsberg and J. Burghartz and G. B. Bronner and
                 S. R. Mader",
  title =        "Selective epitaxial growth of silicon and some
                 potential applications",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "816--827",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In the selective epitaxial growth (SEG) of silicon,
                 growth occurs only on exposed silicon areas of a
                 silicon substrate. Substrate regions on which silicon
                 growth is not desired are masked by a dielectric film,
                 typically silicon dioxide or silicon nitride. Use of
                 the process permits the fabrication of novel silicon
                 devices and integrated-circuit structures. In this
                 paper, an overview is presented of the authors' studies
                 on the SEG process at the IBM Thomas J. Watson Research
                 Center. Aspects covered are the kinetics of the process
                 using a SiCl$_4$ and H$_2$ gaseous mixture, the
                 associated suppression of deposition on silicon dioxide
                 and silicon nitride, and some potential applications of
                 the process to the fabrication of bipolar devices and
                 dynamic random access memory (DRAM) cells.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  chemicalindex = "SiCl4H2/ss Cl4/ss Cl/ss H2/ss Si/ss H/ss; SiO2/bin
                 O2/bin Si/bin O/bin; Si3N4/bin Si3/bin N4/bin Si/bin
                 N/bin; Si/int Si/el",
  classcodes =   "B2550 (Semiconductor device technology); B0510D
                 (Epitaxial growth)",
  classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "IBM; mask; process; process kinetics; Process
                 kinetics; SEG; SEG process; selective epitaxial growth;
                 Selective epitaxial growth; semiconductor epitaxial
                 layers; semiconductor growth; Si growth; Si$_3$N$_4$
                 mask; Si/sub 3/N/sub 4/ mask; SiCl$_4$-H$_2$ gas
                 mixture; SiCl/sub 4/-H$_2$ gas mixture; silicon;
                 SiO$_2$; SiO$_2$ mask; vapour phase epitaxial growth",
  thesaurus =    "Semiconductor epitaxial layers; Semiconductor growth;
                 Silicon; Vapour phase epitaxial growth",
  treatment =    "A Application; P Practical; X Experimental",
}

@Article{Tischler:1990:AMV,
  author =       "M. A. Tischler",
  title =        "Advances in metalorganic vapor-phase epitaxy",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "828--848",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Metalorganic vapor-phase epitaxy (MOVPE) has become a
                 well-established technique for the epitaxial growth of
                 layers of III-V compound semiconductors since its
                 introduction in 1968. Use has been made of the
                 technique to produce such layers and associated devices
                 to very demanding specifications. This paper describes
                 MOVPE, followed by an overview of work at the IBM
                 Thomas J. Watson Research Center on the technique, with
                 emphasis on doping and selective epitaxy. Device
                 applications are included to highlight the need to take
                 into account the influence of materials and growth
                 phenomena in order to produce optimum devices.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B0510D (Epitaxial growth); B2550 (Semiconductor device
                 technology)",
  classification = "B0510D (Epitaxial growth); B2550 (Semiconductor
                 device technology)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "III-V compound semiconductors; III-V semiconductors;
                 layers; metalorganic vapor-phase epitaxy; Metalorganic
                 vapor-phase epitaxy; MOVPE; reviews; Selective epitaxy;
                 selective epitaxy; semiconductor epitaxial;
                 Semiconductor epitaxy; semiconductor epitaxy;
                 semiconductor growth; vapour phase epitaxial growth",
  thesaurus =    "III-V semiconductors; Reviews; Semiconductor epitaxial
                 layers; Semiconductor growth; Vapour phase epitaxial
                 growth",
  treatment =    "B Bibliography; G General Review; X Experimental",
}

@Article{Grill:1990:DCF,
  author =       "A. Grill and B. S. Meyerson and V. V. Patel",
  title =        "Diamondlike carbon films by {RF} plasma-assisted
                 chemical vapor deposition from acetylene",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "849--857",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper is an overview of studies performed at the
                 IBM Thomas J. Watson Research Center on diamondlike
                 carbon (hydrogenated amorphous carbon) films, including
                 some recent results on their tribological properties.
                 The films were prepared by RF plasma-assisted chemical
                 vapor deposition (PACVD) from acetylene. Their
                 structure and composition were characterized by a
                 variety of methods such as X-ray and TEM
                 diffractometry, XPS, high-resolution /sup 13/C NMR
                 spectroscopy, and H(/sup 15/N alpha, gamma)C
                 nuclear-reaction profiling. Their adhesion to various
                 substrates, coefficients of static and dynamic
                 friction, and wear resistance were also characterized.
                 It was found that the films were essentially amorphous,
                 reaching their bulk composition after 40 nm of growth
                 above the initial growth interface. Their bulk
                 composition included about 40\% hydrogen. More
                 diamondlike carbon bonding was obtained at the initial
                 growth interface than in the bulk range. The ratio of
                 sp/sup 2/ to sp/sup 3/ carbon atoms was found to be
                 1.6, with virtually all sp/sup 3/ carbon atoms bound to
                 one or more hydrogen atoms. The diamondlike carbon
                 films (DLC) displayed excellent adhesion to the surface
                 of Si.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "C:H/bin C/bin H/bin C/el H/el H/dop; C:H/int Si/int
                 C/int H/int C:H/bin C/bin H/bin Si/el C/el H/el H/dop",
  classcodes =   "A8115H (Chemical vapour deposition); A8280P (Electron
                 spectroscopy for chemical analysis (photoelectron,
                 Auger spectroscopy, etc.)); A7960E (Semiconductors and
                 insulators); A6855 (Thin film growth, structure, and
                 epitaxy)A7660 (Nuclear magnetic resonance and
                 relaxation); A8140P (Friction, lubrication, and wear);
                 A6220P (Tribology); A8160 (Corrosion, oxidation,
                 etching, and other surface treatments); B0520F (Vapour
                 deposition)",
  classification = "A6220P (Tribology); A6855 (Thin film growth,
                 structure, and epitaxy); A7660 (Nuclear magnetic
                 resonance and relaxation); A7960E (Semiconductors and
                 insulators); A8115H (Chemical vapour deposition);
                 A8140P (Friction, lubrication, and wear); A8160
                 (Corrosion, oxidation, etching, and other surface
                 treatments); A8280P (Electron spectroscopy for chemical
                 analysis (photoelectron, Auger spectroscopy, etc.));
                 B0520F (Vapour deposition)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acetylene; Acetylene; adhesion; Adhesion; amorphous
                 C:H films; Amorphous C:H films; amorphous state; bulk
                 composition; Bulk composition; carbon; coefficient of
                 friction; Coefficient of friction; composition;
                 Composition; deposition; diamondlike carbon films;
                 Diamondlike carbon films; DLC; electron microscope
                 examination of materials; hydrogen; IBM; materials;
                 NMR; NMR spectroscopy; nuclear magnetic;
                 nuclear-reaction profiling; Nuclear-reaction profiling;
                 overview; Overview; PACVD; plasma CVD; plasma-assisted
                 chemical vapor; Plasma-assisted chemical vapor
                 deposition; protective coatings; resistance; resonance;
                 spectroscopy; TEM diffractometry; transmission;
                 tribological properties; Tribological properties;
                 tribology; wear; Wear resistance; wear resistant
                 coatings; X-ray diffraction examination of; X-ray
                 photoelectron spectra; XPS",
  thesaurus =    "Amorphous state; Carbon; Hydrogen; Nuclear magnetic
                 resonance; Plasma CVD; Protective coatings;
                 Transmission electron microscope examination of
                 materials; Tribology; Wear resistant coatings; X-ray
                 diffraction examination of materials; X-ray
                 photoelectron spectra",
  treatment =    "G General Review; X Experimental",
}

@Article{Small:1990:OWV,
  author =       "M. B. Small and D. J. Pearson",
  title =        "On-chip wiring for {VLSI}: Status and directions",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "858--867",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A consequence of scaling to submicron dimensions is
                 that the major component of propagation delay will
                 transfer from the devices to the interconnecting
                 `wires'. Additionally, increased integration, together
                 with scaling, leads to a need for more numerous
                 interconnections on a chip and higher current
                 densities. Accommodation to these changes will
                 necessitate the use of new materials arranged in
                 three-dimensional wiring structures which have the
                 ability to make the most effective use of the area of
                 the chip. Generic processing routes to achieve the
                 desired structures are reviewed and examples are
                 presented of two experimental structures with layers of
                 planar wiring and vertical vias between planes. One of
                 these integrates aluminum-alloy wiring with tungsten
                 vias in a silicon dioxide dielectric; the other
                 integrates copper wiring and vias in polyimide
                 dielectric with the goal of minimizing delay due to
                 on-chip wiring.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Al/bin Al/el; W/el; SiO2/int O2/int Si/int O/int
                 SiO2/bin O2/bin Si/bin O/bin; Cu/el; Cu/el",
  classcodes =   "B2570F (Other MOS integrated circuits); B2550F
                 (Metallisation)",
  classification = "B2550F (Metallisation); B2570F (Other MOS integrated
                 circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Al alloy vias; circuits; Cu vias; Cu wiring;
                 dimensions; experimental; Experimental structures;
                 integrated circuit technology; interconnections;
                 Interconnections; Layers of planar wiring; layers of
                 planar wiring; metallisation; Minimizing delay;
                 minimizing delay; MOS integrated; Multilevel
                 metallisation; multilevel metallisation; On-chip
                 wiring; on-chip wiring; Polyimide dielectric; polyimide
                 dielectric; Propagation delay; propagation delay;
                 Scaling; scaling; SiO$_2$ dielectric; structures;
                 submicron; Submicron dimensions; three-dimensional
                 wiring structures; Three-dimensional wiring structures;
                 Vertical vias; vertical vias; vias; VLSI; W; W vias",
  thesaurus =    "Integrated circuit technology; Metallisation; MOS
                 integrated circuits; VLSI",
  treatment =    "G General Review; X Experimental",
}

@Article{Tu:1990:SIE,
  author =       "K. N. Tu",
  title =        "Surface and interfacial energies of {CoSi$_2$} and
                 {Si} films: Implications regarding formation of
                 three-dimensional silicon-silicide structures",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "868--874",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Formation of three-dimensional, multilevel structures
                 consisting of epitaxial silicon and silicide films is
                 currently of interest in the microelectronics
                 technology. However, such structures have been
                 difficult to produce because of surface wetting
                 differences. To obtain associated surface energy
                 information, an analysis was carried out of published
                 data on the kinetics of crystallization of amorphous
                 CoSi$_2$ and Si films. The analysis indicated that the
                 amorphous-to-crystalline interfacial energy of
                 amorphous CoSi$_2$ films is about one-fourth that of
                 amorphous Si films, from which it was inferred that the
                 surface energy of epitaxial CoSi$_2$ films is less than
                 that of epitaxial Si films. The approach used in the
                 analysis is general and should be extendable to other
                 systems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si-CoSi2/int CoSi2/int Si2/int Co/int Si/int
                 CoSi2/bin Si2/bin Co/bin Si/bin Si/el; Si/el; CoSi2/bin
                 Si2/bin Co/bin Si/bin",
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A6810C (Surface energy (surface tension, interface
                 tension, angle of contact, etc.)); A6840 (Surface
                 energy of solids; thermodynamic properties); B0510D
                 (Epitaxial growth); B2550 (Semiconductor device
                 technology)",
  classification = "A6810C (Surface energy (surface tension, interface
                 tension, angle of contact, etc.)); A6840 (Surface
                 energy of solids; A6855 (Thin film growth, structure,
                 and epitaxy); B0510D (Epitaxial growth); B2550
                 (Semiconductor device technology); thermodynamic
                 properties)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D Si-CoSi$_2$ structures; Amorphous CoSi$_2$ films;
                 amorphous CoSi$_2$ films; amorphous-to-;
                 Amorphous-to-crystalline interfacial energy; cobalt
                 compounds; crystalline interfacial energy; elemental
                 semiconductors; energy; epitaxial; epitaxial CoSi$_2$
                 films; Epitaxial CoSi/sub 2/ films; epitaxial Si;
                 Epitaxial Si films; films; Kinetics of crystallization;
                 kinetics of crystallization; layers; Multilevel
                 structures; multilevel structures; semiconductor;
                 semiconductor epitaxial layers; semiconductors;
                 Semiconductors; Si-CoSi$_2$; silicides; Silicides;
                 silicon; surface; Surface energy; surface energy;
                 Surface wetting differences; surface wetting
                 differences; technology",
  thesaurus =    "Cobalt compounds; Elemental semiconductors; Epitaxial
                 layers; Semiconductor epitaxial layers; Semiconductor
                 technology; Silicon; Surface energy",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Yu:1990:SCW,
  author =       "M. L. Yu and K. Y. Ahn and R. V. Joshi",
  title =        "Surface chemistry of the {WF}$_6$-based chemical vapor
                 deposition of tungsten",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "875--883",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Discusses two deposition processes. In the first
                 process, tungsten deposition occurs through the
                 chemical reduction of WF$_6$ by a silicon substrate.
                 The thickness of the tungsten film thus grown is
                 limited by the transport of silicon through the
                 deposited film. In the second process, deposition
                 occurs in a WF$_6$-silane mixture by the following
                 reactions: reduction of adsorbed WF$_6$ by a surface
                 layer of silicon to form tungsten, and the concurrent
                 dehydrogenation of the adsorbed silane to replenish the
                 silicon. This process permits the deposition of
                 tungsten on any substrate, provided the initial
                 reaction of the substrate with the WF$_6$-silane
                 mixture can provide a tungsten or silicon `seed' layer
                 to initiate the reaction cycle. Furthermore, the
                 process is not limited by tungsten film thickness and
                 hence permits the deposition of relatively thick films.
                 Although surface selectivity is possible with regard to
                 materials such as high-quality SiO$_2$, on which such a
                 seed layer cannot be formed, the selectivity is
                 adversely affected by the presence of particulates.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "WF6/bin F6/bin F/bin W/bin; Si/sur Si/el; WF6SiH4/ss
                 F6/ss H4/ss Si/ss F/ss H/ss W/ss",
  classcodes =   "B2550F (Metallisation); B2570 (Semiconductor
                 integrated circuits); B0520F (Vapour deposition)",
  classification = "B0520F (Vapour deposition); B2550F (Metallisation);
                 B2570 (Semiconductor integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "6/-SiH/sub 4/ gas mixture; chemical vapour deposition;
                 deposition processes; Deposition processes; integrated
                 circuit technology; metallisation; reaction cycle;
                 Reaction cycle; Si substrate; Surface chemistry;
                 surface chemistry; Surface selectivity; surface
                 selectivity; tungsten; tungsten compounds; VLSI; WF$_6$
                 vapour; WF$_6$-SiH$_4$ gas mixture; WF/sub; WF/sub 6/
                 vapour",
  thesaurus =    "Chemical vapour deposition; Integrated circuit
                 technology; Metallisation; Tungsten; Tungsten
                 compounds; VLSI",
  treatment =    "X Experimental",
}

@Article{Speriosu:1990:MTF,
  author =       "V. S. Speriosu and D. A. {Herman, Jr.} and I. L.
                 Sanders and T. Yogi",
  title =        "Magnetic thin films in recording technology",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "884--902",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Reviews recent progress in magnetic thin films for use
                 in recording media and heads. Emphasis is on work that
                 has been carried out at IBM. Topics covered include
                 thin-film media for high-density recording, laminated
                 soft-magnetic films for controlling domains and
                 extending the frequency range of inductive heads,
                 exchange-biasing of magnetoresistive sensors, and
                 magnetic multilayer structures.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  classcodes =   "B3120B (Magnetic recording); B3110C (Ferromagnetic
                 materials)",
  classification = "B3110C (Ferromagnetic materials); B3120B (Magnetic
                 recording)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "biasing of magnetoresistive sensors; controlling
                 domains; Controlling domains; exchange-;
                 Exchange-biasing of magnetoresistive sensors; film
                 media; film recording heads; films; frequency range
                 extension; Frequency range extension; hard discs;
                 high-density recording; High-density recording; IBM;
                 inductive heads; Inductive heads; laminated
                 soft-magnetic; Laminated soft-magnetic films; magnetic;
                 Magnetic; magnetic heads; Magnetic heads; magnetic
                 multilayer; Magnetic multilayer structures; magnetic
                 thin films; Magnetic thin films; recording; recording
                 media; Recording media; Recording technology; reviews;
                 structures; technology; thin; Thin film recording
                 heads; thin film recording media; Thin film recording
                 media; thin-; Thin-film media",
  thesaurus =    "Hard discs; Magnetic heads; Magnetic thin films;
                 Reviews",
  treatment =    "B Bibliography; G General Review; X Experimental",
}

@Article{Farrow:1990:MMS,
  author =       "R. F. C. Farrow and C. H. Lee and S. S. P. Parkin",
  title =        "Magnetic multilayer structures",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "903--915",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This is an overview of work at the IBM Almaden
                 Research Center on magnetic multilayer structures
                 comprising one, several, or many magnetic films
                 sandwiched between nonmagnetic films. In recent years
                 there has been increasing interest in such structures
                 because of their novel and potentially useful
                 properties. Recent examples of magnetic multilayer
                 structures grown by molecular beam epitaxy (MBE) and
                 sputtering are described. It is seen that MBE and
                 sputtering are complementary techniques for the
                 preparation of such structures, and that the ability to
                 modify their magnetic properties by suitably designing
                 their architecture is a key to their further
                 development.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  classcodes =   "A7570F (Magnetic ordering in multilayers); A8115C
                 (Deposition by sputtering); A6855 (Thin film growth,
                 structure, and epitaxy); A8115G (Vacuum deposition);
                 B3110C (Ferromagnetic materials); B0510D (Epitaxial
                 growth)",
  classification = "A6855 (Thin film growth, structure, and epitaxy);
                 A7570F (Magnetic ordering in multilayers); A8115C
                 (Deposition by sputtering); A8115G (Vacuum deposition);
                 B0510D (Epitaxial growth); B3110C (Ferromagnetic
                 materials)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Almaden Research Center; films; IBM; magnetic;
                 magnetic films sandwiched between nonmagnetic; Magnetic
                 films sandwiched between nonmagnetic films; magnetic
                 multilayer; Magnetic multilayer structures; Magnetic
                 properties; magnetic thin films; MBE; molecular beam
                 epitaxial growth; Molecular beam epitaxy; molecular
                 beam epitaxy; properties; reviews; sputtered coatings;
                 Sputtering; sputtering; structures",
  thesaurus =    "Magnetic thin films; Molecular beam epitaxial growth;
                 Reviews; Sputtered coatings",
  treatment =    "G General Review; X Experimental",
}

@Article{Giess:1990:LGP,
  author =       "E. A. Giess and R. L. Sandstrom and W. J. Gallagher
                 and A. Gupta and S. L. Shinde and R. F. Cook and E. I.
                 Cooper and E. J. M. O'Sullivan and J. M. Roldan and A.
                 P. Segmuller and J. Angilello",
  title =        "Lanthanide gallate perovskite-type substrates for
                 epitaxial, high-${T}_c$ superconducting
                 {Ba}$_2${YCu}$_3${O}$_{7-\delta}$ films",
  journal =      j-IBM-JRD,
  volume =       "34",
  number =       "6",
  pages =        "916--926",
  month =        nov,
  year =         "1990",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Previous studies had indicated promising use of
                 lanthanide gallate perovskite-type substrates for the
                 deposition of epitaxial, high-T$_c$ superconducting
                 Ba$_2$YCu$_3$O$_{7-\delta}$ (BYCO) films. They were
                 also found to have moderate dielectric constants (
                 approximately 25 compared to approximately 277 for
                 SrTiO$_3$). This study was undertaken to further
                 explore the use of LaGaO$_3$, NdGaO$_3$, SrTiO$_3$,
                 MgO, and Y-stabilized ZrO$_2$ substrates, prepared from
                 single-crystal boules grown by several suppliers using
                 the Czochralski method. Films were prepared by
                 cylindrical magnetron sputtering and laser ablation.
                 Substrate evaluations included measurement of
                 dielectric constant and loss, thermal expansion, and
                 mechanical hardness and toughness. In addition to their
                 moderate dielectric constants, they were found to have
                 satisfactory mechanical properties, except for the
                 twinning tendency of LaGaO$_3$. Lattice mismatch
                 strains were calculated for orthorhombic BYCO films on
                 a number of substrates. NdGaO$_3$ was found to have the
                 best lattice match with BYCO, and is now available
                 twin-free.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Ba2YCu3O/ss Ba2/ss Cu3/ss Ba/ss Cu/ss O/ss Y/ss;
                 LaGaO3/sur Ga/sur La/sur O3/sur O/sur LaGaO3/ss Ga/ss
                 La/ss O3/ss O/ss; NdGaO3/sur Ga/sur Nd/sur O3/sur O/sur
                 NdGaO3/ss Ga/ss Nd/ss O3/ss O/ss; SrTiO3/sur TiO3/sur
                 O3/sur Sr/sur Ti/sur O/sur SrTiO3/ss TiO3/ss O3/ss
                 Sr/ss Ti/ss O/ss; MgO/sur Mg/sur O/sur MgO/bin Mg/bin
                 O/bin",
  classcodes =   "A7475 (Superconducting films); A7430 (General
                 properties); A7470V (Perovskite phase superconductors);
                 A6855 (Thin film growth, structure, and epitaxy); A6570
                 (Thermal expansion and thermomechanical effects); A7740
                 (Dielectric loss and relaxation); A7720 (Permittivity);
                 B3220 (Superconducting materials)",
  classification = "A6570 (Thermal expansion and thermomechanical
                 effects); A6855 (Thin film growth, structure, and
                 epitaxy); A7430 (General properties); A7470V
                 (Perovskite phase superconductors); A7475
                 (Superconducting films); A7720 (Permittivity); A7740
                 (Dielectric loss and relaxation); B3220
                 (Superconducting materials)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Ba$_2$YCu$_3$O$_{7-\delta}$; Ba$_2$YCu/sub 3/O/sub 7-
                 delta /; barium compounds; cylindrical magnetron;
                 Cylindrical magnetron sputtering; dielectric constants;
                 Dielectric constants; dielectric losses; Dielectric
                 losses; epitaxial films; Epitaxial films; expansion;
                 hardness; high temperature superconductors; High
                 temperature superconductors; high-temperature;
                 LaGaO$_3$; LaGaO/sub 3/; lanthanum compounds; laser
                 ablation; Laser ablation; lattice mismatch strains;
                 Lattice mismatch strains; magnesium compounds;
                 mechanical; Mechanical hardness; mechanical properties;
                 Mechanical properties; MgO; NdGaO/sub 3/; neodymium
                 compounds; permittivity; perovskite-type;
                 Perovskite-type substrates; sputtering; SrTiO$_3$;
                 SrTiO/sub 3/; strontium compounds; substrates;
                 superconducting epitaxial layers; superconductors;
                 tendency; thermal; thermal expansion; Thermal
                 expansion; toughness; Toughness; twinning; Twinning
                 tendency; yttrium compounds; zirconium compounds",
  thesaurus =    "Barium compounds; Dielectric losses; High-temperature
                 superconductors; Lanthanum compounds; Magnesium
                 compounds; Neodymium compounds; Permittivity; Strontium
                 compounds; Substrates; Superconducting epitaxial
                 layers; Thermal expansion; Yttrium compounds; Zirconium
                 compounds",
  treatment =    "X Experimental",
}

@Article{Farrell:1991:PVI,
  author =       "E. J. Farrell",
  title =        "Preface: Visual Interpretation of Complex Data",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "3--3",
  month =        jan,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Bala:1991:FIV,
  author =       "G. P. Bala",
  title =        "{FEMvis}: an interactive visualization tool for
                 mechanical analysis",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "4--11",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "FEMvis is a tool that provides capabilities for
                 interactive visualization of mechanical engineering
                 analysis, including rotation, translation, and
                 magnification of images; views of shape deformations,
                 their time-evolution, and their superposition;
                 visualizations of scalar fields in two or three
                 dimensions using colored isolevels, blending of shape
                 deformation images and isolevel images; visualizations
                 of three-dimensional phenomena by moving a slicing
                 plane through the image, showing cross-sectional
                 deformations and isolevels; and visualizations of
                 multiple shape deformations and multiple scalar fields
                 during a single usage sessions. FEMvis has been
                 implemented in a portable language and a portable
                 graphics package, and can run on a spectrum of hardware
                 platforms from workstations to mainframes. It has been
                 applied to the mechanical analysis of direct-access
                 storage devices (DASD), including stress, strain,
                 modal, and deformation analyses. The interactive nature
                 of FEMvis facilitates iterative design refinement and
                 rapid prototyping.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  classcodes =   "C7440 (Civil and mechanical engineering); C6130B
                 (Graphics techniques); C6180 (User interfaces)",
  classification = "C6130B (Graphics techniques); C6180 (User
                 interfaces); C7440 (Civil and mechanical engineering)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D phenomena; cross-; Cross-sectional deformations;
                 deformation images; direct-access; Direct-access
                 storage devices; engineering analysis; engineering
                 computing; engineering graphics; graphical user
                 interfaces; Interactive visualization; interactive
                 visualization; Isolevel images; isolevel images;
                 Iterative design refinement; iterative design
                 refinement; Magnification; magnification; mechanical;
                 Mechanical analysis; mechanical analysis; Mechanical
                 engineering analysis; Multiple scalar fields; multiple
                 scalar fields; Multiple shape deformations; multiple
                 shape deformations; package; portable graphics;
                 Portable graphics package; Portable language; portable
                 language; prototyping; rapid; Rapid prototyping;
                 Rotation; rotation; sectional deformations; shape;
                 Shape deformation images; Shape deformations; shape
                 deformations; Slicing plane; slicing plane; software
                 packages; storage devices; Superposition;
                 superposition; Time-evolution; time-evolution;
                 Translation; translation; Workstations; workstations",
  thesaurus =    "Engineering graphics; Graphical user interfaces;
                 Mechanical engineering computing; Software packages",
  treatment =    "P Practical; R Product Review",
}

@Article{Koyamada:1991:VVF,
  author =       "K. Koyamada and T. Nishio",
  title =        "Volume visualization of {3D} finite element method
                 results",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "12--25",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes a method for visualizing the
                 output data set of a 3D finite element method result. A
                 linear tetrahedral element is used as a primitive for
                 the visualization processing, and a 3D finite element
                 model is subdivided into a set of these primitives,
                 which are generated at every solid element. With these
                 primitives, isosurfaces are visualized
                 semitransparently from scalar data at each node point.
                 Two methods are developed for the visualization of
                 isosurfaces with and without intermediate geometries.
                 The methods are applied to output data sets from some
                 simulation results of a semiconductor chip. These are
                 visualized, and the effectiveness of the method is
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Tokyo Res. Center, IBM Japan Ltd., Japan",
  classcodes =   "C6130B (Graphics techniques); C7400 (Engineering);
                 C4170 (Differential equations); C4180 (Integral
                 equations)",
  classification = "C4170 (Differential equations); C4180 (Integral
                 equations); C6130B (Graphics techniques); C7400
                 (Engineering)",
  corpsource =   "Tokyo Res. Center, IBM Japan Ltd., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D finite element method; analysis; engineering
                 computing; engineering graphics; finite element;
                 Isosurfaces; isosurfaces; linear; Linear tetrahedral
                 element; Output data set; output data set;
                 Semiconductor chip; semiconductor chip; solid
                 modelling; tetrahedral element",
  thesaurus =    "Engineering computing; Engineering graphics; Finite
                 element analysis; Solid modelling",
  treatment =    "P Practical",
}

@Article{Farrell:1991:VIM,
  author =       "E. J. Farrell and P. A. Appino and D. P. Foty and T.
                 D. {Linton, Jr.}",
  title =        "Visual interpretation of multidimensional computations
                 and transistor design",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "26--44",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "As digital simulations and computations become more
                 complex, larger volumes of output are generated; the
                 engineer must select a concise method of displaying the
                 output and extracting relevant information. The authors
                 describe an experimental system called the Visual
                 Interpretation System (VIS), which provides a wide
                 range of tools for managing the visualization of
                 simulation data. The effectiveness of VIS results from
                 an interactive interface which controls a database
                 manager and a visualization manager. The database
                 consists of entities called data sets that carry a
                 complete description of the geometry and time-dependent
                 behavior of various properties of a simulated physical
                 object. Visualization management involves both 2D and
                 3D imaging in multiple display windows and animation.
                 Three-dimensional data imaging is based on optical
                 modeling with back-to-front perspective projection. The
                 optical model assigns color and attenuation to each
                 point on the basis of its data value. With the
                 appropriate choice of attenuation and color, the user
                 can display multiple 3D regions, either as solids or
                 transparently. This approach is not based on surface,
                 nor does it require the data to have spatial
                 continuity. The usefulness of VIS is demonstrated with
                 data from a large-scale simulation of a transistor.
                 They demonstrate how 3D visualization techniques
                 provide insight into the physics of
                 isolation-trench-bounded devices at both room and low
                 temperatures, which facilitates the development of
                 improved designs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2560R (Insulated gate field effect transistors);
                 C7410D (Electronic engineering); C6130B (Graphics
                 techniques)",
  classification = "B2560R (Insulated gate field effect transistors);
                 C6130B (Graphics techniques); C7410D (Electronic
                 engineering)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D visualization; 3D visualization techniques;
                 Animation; animation; Back-to-front perspective
                 projection; back-to-front perspective projection;
                 circuit analysis computing; Database manager; database
                 manager; dependent behavior; digital; digital
                 simulation; Digital simulations; engineering; graphics;
                 insulated gate field effect transistors; interactive;
                 Interactive interface; interface;
                 Isolation-trench-bounded devices;
                 isolation-trench-bounded devices; Large-scale
                 simulation; large-scale simulation; Multidimensional
                 computations; multidimensional computations; Multiple
                 display windows; multiple display windows; Optical
                 modeling; optical modeling; semiconductor device
                 models; simulations; solid modelling; techniques;
                 time-; Time-dependent behavior; Transistor; transistor;
                 Transistor design; transistor design; transistors;
                 Visual Interpretation System; Visualization manager;
                 visualization manager",
  thesaurus =    "Circuit analysis computing; Digital simulation;
                 Engineering graphics; Insulated gate field effect
                 transistors; Semiconductor device models; Solid
                 modelling; Transistors",
  treatment =    "B Bibliography; P Practical",
}

@Article{Doi:1991:DVU,
  author =       "A. Doi and M. Aono and N. Urano and K. Sugimoto",
  title =        "Data visualization using a general-purpose renderer",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "45--58",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes a general approach to data
                 visualization, based on the Rendering Subroutine
                 Package (RSP). RSP is a general-purpose polygon-based
                 renderer, and is IBM's first rendering application
                 programming interface (API) for users who wish to
                 develop their own applications. The authors present an
                 overview of the system, details of the image synthesis
                 tools, and several examples of the application of RSP
                 to architectural CAD, molecular graphics, and computer
                 tomography.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Yamato Lab., IBM Japan Ltd., Japan",
  classcodes =   "C6130B (Graphics techniques); C7400 (Engineering)",
  classification = "C6130B (Graphics techniques); C7400 (Engineering)",
  corpsource =   "IBM Yamato Lab., IBM Japan Ltd., Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application programming interface; Architectural CAD;
                 architectural CAD; Computer tomography; computer
                 tomography; Data visualization; data visualization;
                 engineering computing; engineering graphics;
                 General-purpose renderer; general-purpose renderer;
                 Image synthesis; image synthesis; Molecular graphics;
                 molecular graphics; Polygon-based renderer;
                 polygon-based renderer; rendering; Rendering; Rendering
                 application programming interface; Rendering Subroutine
                 Package; RSP; solid modelling; Subroutine Package",
  thesaurus =    "Engineering computing; Engineering graphics; Solid
                 modelling",
  treatment =    "P Practical",
}

@Article{Dickinson:1991:IAT,
  author =       "R. R. Dickinson",
  title =        "Interactive analysis of the topology of {4D} vector
                 fields",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "59--66",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Interactive visualization methods are now evolving in
                 response to a need to provide more immediate access to
                 particular features of interest to analysts at
                 particular points in the space and time of their data.
                 The paper focuses on feature extraction methods
                 relevant to the analysis of vector fields. In vector
                 fields, `critical points' are those points at which the
                 vector magnitude passes through zero. The word
                 `topology' is used to describe the interconnection
                 patterns between critical points.Topology is central to
                 the understanding of vector fields. It provides very
                 succinct and precise summary information, and can be
                 used to subdivide large fields into well-defined
                 subregions. Methods for interactively creating maps of
                 vector-field topology are described. The advantages
                 offered by interactive methods in comparison with
                 automatic methods are also discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Pacific Visualization Syst., Senneville, Que.,
                 Canada",
  classcodes =   "C6130B (Graphics techniques); C7310 (Mathematics)",
  classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
  corpsource =   "Pacific Visualization Syst., Senneville, Que.,
                 Canada",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "4D vector fields; computer aided analysis; computer
                 graphics; computing; Critical points; critical points;
                 Feature extraction methods; feature extraction methods;
                 Interconnection patterns; interconnection patterns;
                 mathematics; Topology; topology; Vector magnitude;
                 vector magnitude; vectors",
  thesaurus =    "Computer aided analysis; Computer graphics;
                 Mathematics computing; Vectors",
  treatment =    "P Practical",
}

@Article{Stoll:1991:PPT,
  author =       "E. P. Stoll",
  title =        "Picture processing and three-dimensional visualization
                 of data from scanning tunneling and atomic force
                 microscopy",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "67--77",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The author presents an overview of the current status
                 of picture processing and three-dimensional
                 visualization of data from scanning tunneling
                 microscopy and related techniques. The topics covered
                 include the physical basis of the resolution limit and
                 noise sources in scanning microscopes, the design of
                 restoration filters, and methods of visualizing surface
                 contours and other surface properties by use of
                 shadowing, contour lines, and superimposed colors.
                 Postprocessed images of gold, graphite, biological
                 molecules, the active zone of a laser diode, and
                 silicon illustrate the outstanding quality of these
                 methods.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Zurich Res. Lab., Ruschlikon,
                 Switzerland",
  chemicalindex = "Au/el; Si/el",
  classcodes =   "A0650D (Data gathering, processing, and recording,
                 data displays including digital techniques); A6116D
                 (Electron microscopy determinations); A0780 (Electron
                 and ion microscopes and techniques); C5260B (Computer
                 vision and picture processing); C6130B (Graphics
                 techniques); C7320 (Physics and Chemistry)",
  classification = "A0650D (Data gathering, processing, and recording,
                 data displays including digital techniques); A0780
                 (Electron and ion microscopes and techniques); A6116D
                 (Electron microscopy determinations); C5260B (Computer
                 vision and picture processing); C6130B (Graphics
                 techniques); C7320 (Physics and Chemistry)",
  corpsource =   "IBM Res. Div., Zurich Res. Lab., Ruschlikon,
                 Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D data visualization; Active zone; active zone;
                 atomic; Atomic force microscopy; atomic force
                 microscopy; Au; Biological molecules; biological
                 molecules; colors; computer graphics; computerised;
                 Contour lines; contour lines; force microscopy; Gold;
                 gold; Graphite; graphite; Laser diode; laser diode;
                 Noise sources; noise sources; Picture processing;
                 picture processing; Resolution limit; resolution limit;
                 Restoration filters; restoration filters; Scanning
                 tunneling microscopy; scanning tunneling microscopy;
                 scanning tunnelling microscopy; Shadowing; shadowing;
                 Si; Silicon; silicon; superimposed; Superimposed
                 colors; Surface contours; surface contours; Surface
                 properties; surface properties",
  thesaurus =    "Atomic force microscopy; Computer graphics;
                 Computerised picture processing; Scanning tunnelling
                 microscopy",
  treatment =    "G General Review",
}

@Article{Barberi:1991:DML,
  author =       "F. Barberi and R. Bernstein and M. T. Pareschi and R.
                 Santacroce",
  title =        "Displaying morphological and lithological maps: a
                 numerically intensive computing and visualization
                 application",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "78--87",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Algorithms for evaluating digital terrain models
                 (DEMs) and elevation moments such as slope, aspect,
                 relief, and curvature are discussed. Significant new
                 applications based on the elaboration and display of
                 such data are presented. The results show that the
                 processed data can be used for environmental protection
                 and to identify topography-dependent natural-disaster
                 hazards.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Earth Sci., Pisa Univ., Italy",
  classcodes =   "C6130B (Graphics techniques); C7890 (Other special
                 applications); C5260B (Computer vision and picture
                 processing)",
  classification = "C5260B (Computer vision and picture processing);
                 C6130B (Graphics techniques); C7890 (Other special
                 applications)",
  corpsource =   "Dept. of Earth Sci., Pisa Univ., Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Aspect; aspect; cartography; computer graphics;
                 computerised picture; Curvature; curvature; Digital
                 terrain models; digital terrain models; Elevation
                 moments; elevation moments; Environmental protection;
                 environmental protection; Lithological maps;
                 lithological maps; Natural-disaster hazards;
                 natural-disaster hazards; Numerically intensive
                 computing; numerically intensive computing; Processed
                 data; processed data; processing; Relief; relief;
                 Slope; slope; Visualization; visualization",
  thesaurus =    "Cartography; Computer graphics; Computerised picture
                 processing",
  treatment =    "P Practical",
}

@Article{Turtur:1991:IID,
  author =       "A. Turtur and F. Prampolini and M. Fantini and R.
                 Guarda and M. A. Imperato",
  title =        "{IDB}: an image database system",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "88--96",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Specialized software and hardware tools are needed to
                 work on digital color images: the usability of an image
                 system implies the availability of such resources
                 inside a coherent environment and a friendly user
                 interface. Furthermore, a large volume of data must be
                 efficiently stored and retrieved. To cope with these
                 problems, the prototype of an image database system,
                 named IDB, has been developed to manage image data in
                 an integrated way. The important features of the system
                 are distributed functions, a multi-user environment,
                 interactivity, and modularity.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Rome Sci. Center., Italy",
  classcodes =   "C6160Z (Other DBMS)",
  classification = "C6160Z (Other DBMS)",
  corpsource =   "IBM Rome Sci. Center., Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "database management systems; Digital color images;
                 digital color images; Distributed functions;
                 distributed functions; environment; Hardware tools;
                 hardware tools; Image database system; image database
                 system; Interactivity; interactivity; Modularity;
                 modularity; multi-user; Multi-user environment; User
                 interface; user interface",
  thesaurus =    "Database management systems",
  treatment =    "P Practical",
}

@Article{Young:1991:VSH,
  author =       "F. W. Young and P. Rheingans",
  title =        "Visualizing structure in high-dimensional multivariate
                 data",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "97--107",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors present and discuss several dynamic
                 statistical graphics tools designed to help the data
                 analyst visually discover and formulate hypotheses
                 about the structure of multivariate data. All tools are
                 based on the notion of the `data space,' a
                 representation of multivariate data as a
                 high-dimensional (hD) space which has a dimension for
                 each variable (column of the data) and a point for each
                 case (row of the data). The data space is projected
                 orthogonally onto the `visual space,' a
                 three-dimensional space which is seen and manipulated
                 by the data analyst. The visual space has a point-like
                 object for each case and can have a vector-like object
                 for each variable. The three dimensions of the visual
                 space are orthogonal linear combinations of the
                 variables. They discuss the notion of a `guided tour'
                 of multivariate data space, and present guided-tour
                 tools, including: (1) 6D-rotation, a tool for
                 dynamically rotating, in six-dimensional (6D) space,
                 from one 3D portion of the data space to another while
                 displaying the dynamically changing projection in the
                 visual space; (2) hD-residualization, a tool that
                 determines, at the user's request, the largest
                 invisible 3D space; (3) projection-cueing, a group of
                 three tools that use change in object brightness as a
                 cue to show change in aspects of the projection of
                 objects from the data space to the visual space during
                 hD-rotation. In addition to these tools for touring
                 high-dimensional multivariate space, they discuss tools
                 for manipulating the 3D visual space, and a tool for
                 examining the relationship between two data spaces.
                 Finally they present a guided-tour implementation in
                 which the user manipulates joysticks and sliders to
                 dynamically and smoothly control the graphics tools in
                 real time.",
  acknowledgement = ack-nhfb,
  affiliation =  "North Carolina Univ., Chapel Hill, NC, USA",
  classcodes =   "C6130B (Graphics techniques); C7310 (Mathematics)",
  classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
  corpsource =   "North Carolina Univ., Chapel Hill, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "6D-rotation; computer graphics; data analysis; Data
                 analyst; data analyst; Data space; data space; Graphics
                 tools; graphics tools; Guided-tour tools; guided-tour
                 tools; hD-; HD-residualization; Multivariate data;
                 multivariate data; Object brightness; object
                 brightness; Projection-cueing; projection-cueing;
                 residualization; statistical; statistical analysis;
                 Statistical graphics; statistical graphics; Statistical
                 graphics tools; Structure visualization; structure
                 visualization; Visual space; visual space",
  thesaurus =    "Computer graphics; Data analysis; Statistical
                 analysis",
  treatment =    "P Practical",
}

@Article{Williams:1991:VMD,
  author =       "G. N. Williams and E. L. Nelson and D. M. Barnett and
                 K. Parmley",
  title =        "Visualization of molecular dynamics via ray-tracing
                 and animation in a vectorized environment",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "108--118",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Scientific visualization methodologies are being
                 utilized increasingly in attempts to understand
                 physical phenomena via mathematical and simulation
                 model results. The authors present the results of a
                 visualization project which produced a vectorized,
                 high-resolution, ray-traced animation of the dynamics
                 of a protein molecule. The resulting animation was
                 recorded on 35-mm film, with a resolution of 1024*1024
                 pixels with 24 color bits. Run-time statistics were
                 also collected which relate image generation parameter
                 ranges and interdependencies.",
  acknowledgement = ack-nhfb,
  affiliation =  "Texas A and M Univ., College Station, TX, USA",
  classcodes =   "A8715H (Molecular dynamics, molecular probes,
                 molecular pattern recognition); C7320 (Physics and
                 Chemistry); C6130B (Graphics techniques)",
  classification = "A8715H (Molecular dynamics, molecular probes,
                 molecular pattern recognition); C6130B (Graphics
                 techniques); C7320 (Physics and Chemistry)",
  corpsource =   "Texas A and M Univ., College Station, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1024; 1024 Pixels; 1048576 Pixels; 1048576 pixels;
                 Animation; animation; computer animation; computer
                 graphics; environment; geometrical optics; molecular
                 biophysics; Molecular dynamics; molecular dynamics;
                 physics computing; pixels; Protein molecule; protein
                 molecule; proteins; Ray-tracing; ray-tracing;
                 vectorized; Vectorized environment; Visualization
                 project; visualization project",
  numericalindex = "Picture size 1.024E+03 pixel; Picture size
                 1.048576E+06 pixel",
  thesaurus =    "Computer animation; Computer graphics; Geometrical
                 optics; Molecular biophysics; Physics computing;
                 Proteins",
  treatment =    "P Practical",
}

@Article{Briscolini:1991:ACS,
  author =       "M. Briscolini and P. Santangelo",
  title =        "Animation of computer simulations of two-dimensional
                 turbulence and three-dimensional flows",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "119--139",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "One of the most challenging problems in fluid dynamics
                 is understanding the properties of turbulent flows. The
                 advent of large supercomputers permits the
                 investigation of turbulence with great accuracy in two
                 dimensions, but full three-dimensional problems are
                 physically more complex and their study is currently
                 limited to the case of simple flows. It is shown that
                 the availability of a continuous time-dependent
                 representation of the dynamics of fluid flows can
                 quickly lead to more complete understanding of the many
                 concurrent physical mechanisms ruling turbulence. Some
                 significant examples show how an analog videotape,
                 obtained from direct computer simulations of fluid
                 flows, suggests physical results that can later be
                 obtained through a mathematical analysis of the
                 numerical simulations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  classcodes =   "A4725 (Turbulent flows, convection, and heat
                 transfer); A4780 (Instrumentation for fluid dynamics);
                 C7320 (Physics and Chemistry); C6130B (Graphics
                 techniques)",
  classification = "A4725 (Turbulent flows, convection, and heat
                 transfer); A4780 (Instrumentation for fluid dynamics);
                 C6130B (Graphics techniques); C7320 (Physics and
                 Chemistry)",
  corpsource =   "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2D turbulence; 3D flows; computer animation; Computer
                 simulations; computer simulations; continuous
                 time-dependent; Continuous time-dependent
                 representation; digital simulation; dynamics; flow
                 visualisation; fluid; Fluid dynamics; Fluid flows;
                 fluid flows; physics computing; representation;
                 Supercomputers; supercomputers; turbulence",
  thesaurus =    "Computer animation; Digital simulation; Flow
                 visualisation; Physics computing; Turbulence",
  treatment =    "P Practical",
}

@Article{Arnold:1991:NIC,
  author =       "R. F. Arnold and P. Halpern and G. R. Hogsett and B.
                 T. Straka and C. Arasmith and J. McElroy",
  title =        "A numerically intensive computing environment: {IBM}
                 3090 and the {PS/2 Model 80}",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "140--155",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Recent advances in personal computer workstations,
                 such as the IBM Personal System/2 Model 80 with its
                 increased memory and CPU speed, loosely coupled with a
                 host IBM 3090 Processor, can provide considerable
                 computing advantages for executing and visualizing
                 numerically intensive computing (NIC) applications. The
                 authors have developed a prototype visualization
                 environment which demonstrates effective use of this
                 hardware. The user interface for the NIC application is
                 written using Microsoft Windows on the PS/2 Model 80
                 running DOS 3.3. The PS/2 Model 80 is connected to a
                 host 3090 via a PC network. The user enters requests
                 which are application parameters and selects graphic
                 views for displaying the output results file. The
                 entries are made through user dialog screens on the
                 workstations. The user view of the system is such that
                 it appears that it is running on the workstation. To
                 achieve this transparency, file caches are used on both
                 the workstation and the host. The cache on the host is
                 in the form of graphic metafiles and numeric data. The
                 cache on the workstation contains metafiles. Requests
                 are monitored on the workstation to determine whether
                 the results are in the local cache. When they are not,
                 a request file is transferred to the host and checked
                 against the host cache. The NIC application is run only
                 when the requested result is not in either cache. In
                 order to reduce the file size, the results file is
                 converted to a metafile before being transferred to the
                 workstation.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Palo Alto Sci. Center, CA, USA",
  classcodes =   "C5540 (Terminals and graphic displays)",
  classification = "C5540 (Terminals and graphic displays)",
  corpsource =   "IBM Palo Alto Sci. Center, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "80; caches; computer graphic equipment; DOS 3.3; file;
                 File caches; Graphic metafiles; graphic metafiles; IBM
                 3090 Processor; IBM computers; IBM Personal System/2
                 Model; IBM Personal System/2 Model 80; interface;
                 Microsoft Windows; Numeric data; numeric data; Personal
                 computer workstations; personal computer workstations;
                 Transparency; transparency; user; User interface;
                 Visualization environment; visualization environment;
                 workstations",
  thesaurus =    "Computer graphic equipment; IBM computers;
                 Workstations",
  treatment =    "P Practical",
}

@Article{Moini:1991:AVT,
  author =       "S. Moini",
  title =        "Application of visualization tools in solid
                 mechanics",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "156--166",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "With increasingly complex digital simulations and
                 computations, large volumes of numerical output are
                 generated, and users must select more effective
                 techniques for handling and displaying such output in
                 order to extract relevant information. In this study,
                 visualization techniques such as animation, tracking,
                 and 2D/3D color displays are imbedded in implicit and
                 explicit finite element codes for solving complex
                 solid-mechanics problems. With these techniques, the
                 investigator can more fully utilize computer time and
                 better understand the results of long and costly
                 computations. This investigation demonstrates the
                 effectiveness of different visualization techniques and
                 distributed computing on an IBM platform.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Sci. Center, Palo Alto, CA, USA",
  classcodes =   "C7440 (Civil and mechanical engineering); C6130B
                 (Graphics techniques)",
  classification = "C6130B (Graphics techniques); C7440 (Civil and
                 mechanical engineering)",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2D/3D color displays; analysis; Animation; animation;
                 codes; Digital simulation; digital simulation;
                 engineering graphics; finite element; Finite element
                 codes; IBM platform; Solid mechanics; solid mechanics;
                 Solid-mechanics problems; solid-mechanics problems;
                 structural engineering computing; Tracking; tracking;
                 Visualization tools; visualization tools",
  thesaurus =    "Digital simulation; Engineering graphics; Finite
                 element analysis; Structural engineering computing",
  treatment =    "P Practical",
}

@Article{Piccolo:1991:GWS,
  author =       "F. Piccolo and V. Zecca and A. Grimaudo and C.
                 Loiodice",
  title =        "Graphic workstations and supercomputers: an integrated
                 environment for simulation of fluid dynamics problems",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "167--183",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An integrated environment for simulation and
                 visualization of physics and engineering problems of
                 industrial interest has been set up at the IBM European
                 Center for Scientific and Engineering Computing
                 (ECSEC). Te paper describes the environment, its
                 components, and some experiments carried on at ECSEC to
                 represent 3D objects displayed with the shading
                 technique and the solution of fluid dynamics problems,
                 all treated with the finite element method. Moreover,
                 the paper describes the animation experiments developed
                 to represent dynamics phenomena (fluid flows) and
                 presents a videotape showing the time evolution of
                 three fluid dynamics study cases.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Italy Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  classcodes =   "A4780 (Instrumentation for fluid dynamics); C5540
                 (Terminals and graphic displays); C7320 (Physics and
                 Chemistry); C6130B (Graphics techniques)",
  classification = "A4780 (Instrumentation for fluid dynamics); C5540
                 (Terminals and graphic displays); C6130B (Graphics
                 techniques); C7320 (Physics and Chemistry)",
  corpsource =   "IBM Italy Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D objects; Animation experiments; animation
                 experiments; computer graphic equipment; computer
                 graphics; Dynamics phenomena; dynamics phenomena;
                 ECSEC; element analysis; environment; finite; Finite
                 element method; finite element method; flow
                 visualisation; Fluid dynamics; fluid dynamics; Graphics
                 workstations; graphics workstations; integrated;
                 Integrated environment; physics computing; shading;
                 Shading technique; Supercomputers; supercomputers;
                 technique",
  thesaurus =    "Computer graphic equipment; Computer graphics; Finite
                 element analysis; Flow visualisation; Physics
                 computing",
  treatment =    "P Practical",
}

@Article{Treinish:1991:CVT,
  author =       "L. A. Treinish and C. Goettsche",
  title =        "Correlative visualization techniques for
                 multidimensional data",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "184--204",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Critical to the understanding of data is the ability
                 to provide pictorial or visual representations of those
                 data, particularly in support of correlative data
                 analysis. Despite the many advances in visualization
                 techniques for scientific data over the last several
                 years, there are still significant problems in bringing
                 today's hardware and software technology into the hands
                 of the typical scientist. A generalized approach to
                 data visualization is critical for the correlative
                 analysis of distinct, complex, multidimensional data
                 sets in the space and earth sciences. Different classes
                 of data representation techniques must be used within
                 such a framework, which can range from simple, static
                 two- and three-dimensional line plots to animation,
                 surface rendering, and volumetric imaging. Static
                 examples of actual data analyses illustrate the
                 importance of an effective pipeline in a data
                 visualization system.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6130B (Graphics techniques); C7310 (Mathematics)",
  classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; Animation; animation; computer animation;
                 computer graphics; data; Data analysis; data analysis;
                 Multidimensional data; multidimensional data;
                 rendering; Representation techniques; representation
                 techniques; surface; Surface rendering; Visual
                 representations; visual representations; Volumetric
                 imaging; volumetric imaging",
  thesaurus =    "Computer animation; Computer graphics; Data analysis",
  treatment =    "P Practical",
}

@Article{Peskin:1991:IQV,
  author =       "R. L. Peskin and S. S. Walther and A. M. Froncioni and
                 T. I. Boubez",
  title =        "Interactive quantitative visualization",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "205--226",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Interactive quantitative visualization, a methodology
                 to enhance scientific and engineering computational
                 simulation prototyping, is defined. Appropriate
                 strategies for implementing IQV in a workstation-based
                 distributed computing environment are discussed.
                 Object-oriented graphical tools and a new data
                 management technique to support IQV and computational
                 steering are described. Two examples of IQV and
                 computational steering are presented: (1) a system to
                 allow interactive solution and visualization of
                 nonlinear boundary-value problems; and (2) a modeling
                 exercise illustrating how IQV and computational
                 steering are used together to prototype simulation of a
                 complex physical system, namely a flag flapping in the
                 wind.",
  acknowledgement = ack-nhfb,
  affiliation =  "Rutgers Univ., Puscataway, NJ, USA",
  classcodes =   "C6130B (Graphics techniques); C7320 (Physics and
                 Chemistry)",
  classification = "C6130B (Graphics techniques); C7320 (Physics and
                 Chemistry)",
  corpsource =   "Rutgers Univ., Puscataway, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "boundary-value problems; Complex physical system;
                 complex physical system; Computational steering;
                 computational steering; computer graphics; computing
                 environment; data management; Data management
                 technique; distributed; Distributed computing
                 environment; Flag flapping; flag flapping; Graphical
                 tools; graphical tools; interactive quantitative;
                 Interactive quantitative visualization; IQV; nonlinear
                 boundary-value; Nonlinear boundary-value problems;
                 object-oriented; Object-oriented tools; object-oriented
                 tools; physics computing; problems; programming;
                 Simulation prototyping; simulation prototyping;
                 technique; visualization",
  thesaurus =    "Boundary-value problems; Computer graphics;
                 Object-oriented programming; Physics computing",
  treatment =    "P Practical",
}

@Article{Pickover:1991:PRG,
  author =       "C. A. Pickover",
  title =        "Picturing randomness on a graphics supercomputer",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "227--230",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper provides a light introduction to a simple
                 graphics technique which can be used to represent
                 random data on a graphics supercomputer. The
                 representation, called a noise-sphere, can be used to
                 detect `bad' random-number generators with little
                 training on the part of the observer. The system uses
                 lighting and shading facilities of 3D extensions to the
                 X-Windows or the PHIGS+ standard. Computational recipes
                 and suggestions for future experiments are included.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C6130B (Graphics techniques); C7310 (Mathematics)",
  classification = "C6130B (Graphics techniques); C7310 (Mathematics)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer graphics; Graphics supercomputer; graphics
                 supercomputer; Graphics technique; graphics technique;
                 Lighting; lighting; mathematics computing;
                 Noise-sphere; noise-sphere; PHIGS+ standard; Random
                 data; random data; random processes; Random-number
                 generators; random-number generators; Randomness;
                 randomness; Shading; shading; X-Windows",
  thesaurus =    "Computer graphics; Mathematics computing; Random
                 processes",
  treatment =    "P Practical",
}

@Article{Paolini:1991:IGT,
  author =       "G. V. Paolini and P. Santangelo",
  title =        "An interactive graphic tool to plot the structure of
                 large sparse matrices",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "231--237",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Many engineering and scientific problems involve the
                 solution of large sparse linear systems. To determine
                 an optimal solving strategy for such systems, it is
                 essential to understand the large- and small-scale
                 properties of the associated sparse matrices. The
                 authors presents a graphic tool to analyze the sparsity
                 pattern and the numeric structure of these matrices.
                 Through examples, drawn from our practical experience,
                 they demonstrate the effectiveness and the interactive
                 features of the tool. These features include zooming,
                 scrolling in different directions, sorting of rows
                 and/or columns, and selective plotting, according to
                 the values of the matrix coefficients.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  classcodes =   "C6130B (Graphics techniques); C4140 (Linear algebra);
                 C7310 (Mathematics)",
  classification = "C4140 (Linear algebra); C6130B (Graphics
                 techniques); C7310 (Mathematics)",
  corpsource =   "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer graphics; Interactive graphic tool;
                 interactive graphic tool; Large sparse matrices; large
                 sparse matrices; mathematics computing; matrix algebra;
                 optimal; Optimal solving strategy; Scrolling;
                 scrolling; Selective plotting; selective plotting;
                 solving strategy; Sorting; sorting; Sparse matrices;
                 sparse matrices; Sparsity pattern; sparsity pattern;
                 Zooming; zooming",
  thesaurus =    "Computer graphics; Mathematics computing; Matrix
                 algebra",
  treatment =    "P Practical",
}

@Article{DeMaris:1991:VVD,
  author =       "D. L. DeMaris",
  title =        "Visualization in a {VLSI} design automation system",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "238--243",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Problems unique to the visualization of complex,
                 partially automated design tasks such as VLSI system
                 design are reviewed, and approaches are described. The
                 design domain used to illustrate the approaches is
                 chip-level floor-planning, an iterative-refinement
                 design methodology for VLSI layout, routing, and timing
                 control. The general view structure and control
                 structure are described. Other visualization topics
                 addressed are display of evolving data, sequencing of
                 overlay data, an interleaved temperature-color metaphor
                 for view consistency and clarity, and dynamically
                 generated iconic measurement tools.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B1265B (Logic circuits); B1130B (Computer-aided
                 circuit analysis and design); C7410D (Electronic
                 engineering); C6130B (Graphics techniques)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); C6130B (Graphics techniques);
                 C7410D (Electronic engineering)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chip-level; Chip-level floor-planning; circuit layout
                 CAD; circuits; engineering graphics; Evolving data;
                 evolving data; floor-planning; iconic; Iconic
                 measurement tools; integrated logic;
                 Iterative-refinement design; iterative-refinement
                 design; Logic circuits; logic circuits; measurement
                 tools; Overlay data; overlay data; Routing; routing;
                 Temperature-color metaphor; temperature-color metaphor;
                 Timing control; timing control; View consistency; view
                 consistency; VLSI; VLSI design automation system; VLSI
                 layout",
  thesaurus =    "Circuit layout CAD; Engineering graphics; Integrated
                 logic circuits; VLSI",
  treatment =    "P Practical",
}

@Article{Wejchert:1991:VPN,
  author =       "J. Wejchert and G. Tesauro",
  title =        "Visualizing processes in neural networks",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "244--253",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A real-time visualization toolkit has been designed to
                 study processes in neural network learning. To date,
                 relatively little attention has been given to
                 visualizing these complex, nonlinear systems. Two new
                 visualization methods are introduced and then applied.
                 One represents synaptic weight data as `bonds' of
                 varying length embedded in the geometrical structure of
                 a network. The other maps the temporal trajectory of
                 the system in a multidimensional configuration space as
                 a two-dimensional diagram. Two-dimensional graphics
                 were found to be sufficient for representing dynamic
                 neural processes. As an application, the visualization
                 tools are linked to simulations of networks learning
                 various Boolean functions. A multiwindow environment
                 allows different aspects of the simulation to be viewed
                 simultaneously using real-time animations. The
                 visualization toolkit can be used in a number of ways:
                 to see how solutions to a particular problem are
                 obtained; to observe how different parameters affect
                 learning dynamics; and to identify the decision stages
                 of learning.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Sci. Centre, Winchester, UK",
  classcodes =   "C7430 (Computer engineering); C1230D (Neural nets);
                 C6130B (Graphics techniques); C1240 (Adaptive system
                 theory)",
  classification = "C1230D (Neural nets); C1240 (Adaptive system
                 theory); C6130B (Graphics techniques); C7430 (Computer
                 engineering)",
  corpsource =   "IBM Sci. Centre, Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2D diagram; Boolean; Boolean functions; configuration
                 space; Dynamic neural processes; dynamic neural
                 processes; engineering graphics; functions; learning
                 systems; multidimensional; Multidimensional
                 configuration space; Multiwindow environment;
                 multiwindow environment; neural nets; Neural network
                 learning; neural network learning; Neural networks;
                 neural networks; Nonlinear systems; nonlinear systems;
                 real-; Real-time animations; real-time animations;
                 real-time visualization; Real-time visualization
                 toolkit; Synaptic weight data; synaptic weight data;
                 Temporal trajectory; temporal trajectory; time systems;
                 toolkit; virtual machines",
  thesaurus =    "Engineering graphics; Learning systems; Neural nets;
                 Real-time systems; Virtual machines",
  treatment =    "P Practical",
}

@Article{Bernaschi:1991:TVM,
  author =       "M. Bernaschi and E. Marinari and S. Patarnello and S.
                 Succi",
  title =        "Three-dimensional visualization of many-body system
                 dynamics",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "254--269",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes a graphic rendering system for use
                 in visualizing the behavior of three-dimensional
                 physical systems. The tool is general and allows the
                 user to characterize a great variety of phenomena. The
                 only requirement is that the physical system be
                 represented by variables defined on quantifiable
                 positions (sites) within a three-dimensional grid. The
                 variables may be discrete (e.g., binary), real, or even
                 complex numbers. The first part gives a technical
                 description of the graphic program, which is based on a
                 graPHIGS interface. The hardware platform consists of
                 an IBM 5080 graphic workstation with a 5081
                 high-resolution monitor which can be driven either by a
                 machine employing IBM System/370 architecture with
                 VM/XA or by a RISC System/6000 workstation running
                 under AIX. The second part describes three different
                 examples of the application of this tool: discrete spin
                 models, quantum chromodynamics (QCD), and
                 three-dimensional turbulence.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  classcodes =   "A0550 (Lattice theory and statistics; Ising problems);
                 A4780 (Instrumentation for fluid dynamics); A4725
                 (Turbulent flows, convection, and heat transfer);
                 A1235C (General properties of quantum chromodynamics
                 (dynamics, confinement, etc.)); C7320 (Physics and
                 Chemistry); C6130B (Graphics techniques)",
  classification = "A0550 (Lattice theory and statistics; A1235C
                 (General properties of quantum chromodynamics
                 (dynamics, confinement, etc.)); A4725 (Turbulent flows,
                 convection, and heat transfer); A4780 (Instrumentation
                 for fluid dynamics); C6130B (Graphics techniques);
                 C7320 (Physics and Chemistry); Ising problems)",
  corpsource =   "IBM Eur. Center for Sci. and Eng. Comput., Rome,
                 Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D visualization; AIX; chromodynamics; colour model;
                 computer graphics; computing; Discrete spin models;
                 discrete spin models; flow visualisation; graphic;
                 Graphic rendering system; GraPHIGS; graPHIGS;
                 High-resolution monitor; high-resolution monitor; IBM
                 5080 graphic workstation; IBM System/370 architecture;
                 lattice; many-body problems; Many-body system dynamics;
                 many-body system dynamics; physics; quantum; Quantum
                 chromodynamics; rendering system; RISC System/6000;
                 solid modelling; theory and statistics; Turbulence;
                 turbulence; VM/XA",
  thesaurus =    "Colour model; Computer graphics; Flow visualisation;
                 Lattice theory and statistics; Many-body problems;
                 Physics computing; Solid modelling; Turbulence",
  treatment =    "P Practical",
}

@Article{Szelenyi:1991:VPE,
  author =       "F. Szelenyi and V. Zecca",
  title =        "Visualizing parallel execution of {FORTRAN} programs",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "270--282",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "As a first step toward the parallel execution analysis
                 of FORTRAN programs, a tool called the Parallel
                 Execution Profiler has been designed and implemented
                 for the graphical postexecution analysis of parallel
                 programs using the Parallel FORTRAN environment as a
                 vehicle for both implementing parallel programs and
                 tracing parallel events. The dynamic behavior of
                 parallel execution is observed interactively in color
                 graphs, which can be displayed concurrently with the
                 source code, and in statistical summaries. The paper
                 describes the implementation of the tool for parallel
                 performance analysis with the aid of a parallelized
                 application program from plasma physics.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Germany Stuttgart, Germany",
  classcodes =   "C6115 (Programming support); C6140D (High level
                 languages); C6150G (Diagnostic, testing, debugging and
                 evaluating systems); C6130B (Graphics techniques)",
  classification = "C6115 (Programming support); C6130B (Graphics
                 techniques); C6140D (High level languages); C6150G
                 (Diagnostic, testing, debugging and evaluating
                 systems)",
  corpsource =   "IBM Germany Stuttgart, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "color; Color graphs; computer graphics; Execution
                 Profiler; FORTRAN; FORTRAN program; Graphical
                 postexecution analysis; graphical postexecution
                 analysis; graphs; Parallel; Parallel execution
                 analysis; parallel execution analysis; Parallel
                 Execution Profiler; Parallel FORTRAN environment;
                 Parallel performance analysis; parallel performance
                 analysis; parallel programming; Parallel programs;
                 parallel programs; Plasma physics; plasma physics;
                 software; tools",
  thesaurus =    "Computer graphics; FORTRAN; Parallel programming;
                 Software tools",
  treatment =    "P Practical",
}

@Article{Schlig:1991:STI,
  author =       "E. S. Schlig",
  title =        "A 3072 $\times$ 32-stage {TDI} imaging device",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "283--287",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A 3072*32-stage TDI charge-coupled imaging device is
                 described. It is believed to be the first reported TDI
                 imager suitable for 300-pel-per-inch document scanning.
                 Its large photocharge capacity gives it the noise
                 performance and dynamic range required for high-quality
                 gray-scale and color imaging in publishing and museum
                 applications. Design options for high-resolution TDI
                 imagers and the uniformity enhancement provided by the
                 TDI mode of operation are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C5530 (Pattern recognition and computer vision
                 equipment)",
  classification = "C5530 (Pattern recognition and computer vision
                 equipment)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "charge-coupled devices; document; Document scanning;
                 dynamic; Dynamic range; image scanners; museum
                 applications; Museum applications; noise performance;
                 Noise performance; photocharge capacity; Photocharge
                 capacity; publishing; Publishing; range; scanning; TDI
                 charge-coupled imaging device; TDI imager",
  thesaurus =    "Charge-coupled devices; Image scanners",
  treatment =    "P Practical",
}

@Article{Heidelberger:1991:TSU,
  author =       "P. Heidelberger and P. A. Franaszek",
  title =        "Traffic studies of unbuffered {Delta} networks",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "1/2",
  pages =        "288--299",
  month =        jan # "\slash " # mar,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper analyzes the performance of unbuffered Delta
                 networks under a nonuniform ('hot-spot') traffic
                 pattern. Particular attention is paid to characterizing
                 the overflow traffic of unsuccessfully transmitted
                 packets. Analytic techniques are used to show that the
                 overflow traffic from an unbuffered packet-switched
                 Delta network is (fractionally) hotter than the offered
                 load. Simulation techniques are used to extend this
                 result to an unbuffered circuit-switched network with
                 limited retrials. In addition, the distribution of the
                 number of trials until a `cold' packet is successfully
                 delivered is shown to have a decreasing hazard rate,
                 which means that it becomes less and less likely with
                 each successive trial that a packet is delivered
                 successfully. The implications of these results for
                 hierarchical networks, a class of networks for
                 interconnecting a highly parallel, shared-memory
                 multiprocessor computer system, are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B6150C (Switching theory); C4230 (Switching theory)",
  classification = "B6150C (Switching theory); C4230 (Switching
                 theory)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Delta network; Hierarchical networks; hierarchical
                 networks; MIN; multiprocessor interconnection networks;
                 overflow; Overflow traffic; packet switching;
                 packet-switched; Packet-switched Delta network;
                 performance evaluation; shared-memory multiprocessor
                 computer; Shared-memory multiprocessor computer system;
                 system; telecommunication traffic; traffic; Traffic
                 studies; traffic studies; Unbuffered circuit-switched
                 network; unbuffered circuit-switched network;
                 Unbuffered Delta networks; unbuffered Delta networks;
                 Unsuccessfully transmitted packets; unsuccessfully
                 transmitted packets",
  thesaurus =    "Multiprocessor interconnection networks; Packet
                 switching; Performance evaluation; Telecommunication
                 traffic",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Nohilly:1991:PES,
  author =       "W. Nohilly and S. Hajek and R. Hawryluk",
  title =        "Preface: {Enterprise System 9000 Type 9121} Air-Cooled
                 Processor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "306--306",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Hajek:1991:IES,
  author =       "S. F. Hajek",
  title =        "The {IBM Enterprise System\slash 9000 Type 9121}
                 air-cooled processor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "307--312",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM Enterprise System/9000 Type 9121 air-cooled
                 processor achieves, with the same or reduced physical
                 floor space and power levels, a performance level equal
                 to or greater than those of previous IBM processors.
                 This performance level was attained by a combination of
                 design innovations: a new air-cooled thermal conduction
                 module (TCM), integration of bipolar and CMOS
                 technology in this TCM, the design and implementation
                 of a differential current switch bipolar circuit
                 family, integrated programmable memory subsystem
                 design, and extensive use of VLSI technology. The
                 result of these innovations was a 15-ns-cycle
                 air-cooled machine. The salient features and an
                 overview of the machine design are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Kingston, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers); C5470
                 (Performance evaluation and testing)",
  classification = "C5420 (Mainframes and minicomputers); C5470
                 (Performance evaluation and testing)",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled thermal conduction module; Air-cooled
                 thermal conduction module; bipolar technology; Bipolar
                 technology; CMOS technology; cooled processor;
                 differential current switch bipolar circuit;
                 Differential current switch bipolar circuit family;
                 evaluation; family; IBM computers; IBM Enterprise
                 System/9000 Type 9121 air-; IBM Enterprise System/9000
                 Type 9121 air-cooled processor; integrated programmable
                 memory subsystem; Integrated programmable memory
                 subsystem; mainframes; packaging; performance;
                 performance level; Performance level; physical floor
                 space; Physical floor space; power levels; Power
                 levels; technology; VLSI; VLSI technology",
  thesaurus =    "IBM computers; Mainframes; Packaging; Performance
                 evaluation; VLSI",
  treatment =    "P Practical",
}

@Article{Eichelberger:1991:DCS,
  author =       "E. B. Eichelberger and S. E. Bello",
  title =        "Differential current switch --- High performance at
                 low power",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "313--320",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The recent IBM System/390 announcement includes six
                 high-performance air-cooled models that use a low-power
                 variation of emitter-coupled logic (ECL). This new
                 logic family, called differential current switch (DCS),
                 uses differential signal pairs to represent logic with
                 dotting to implement a complete set of logic circuits.
                 These DCS circuits are described in detail, and the
                 relative value of the DCS and ECL logic families is
                 discussed extensively.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Kingston, NY, USA",
  classcodes =   "B1265B (Logic circuits); C5120 (Logic and switching
                 circuits)",
  classification = "B1265B (Logic circuits); C5120 (Logic and switching
                 circuits)",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled models; Air-cooled models; current switch;
                 differential; Differential current switch; differential
                 signal pairs; Differential signal pairs; dotting;
                 Dotting; emitter-coupled logic; Emitter-coupled logic;
                 integrated logic circuits; logic; Logic; logic
                 circuits; Logic circuits",
  thesaurus =    "Emitter-coupled logic; Integrated logic circuits",
  treatment =    "A Application; P Practical",
}

@Article{Chu:1991:CSR,
  author =       "J. L. Chu and H. R. Torabi and F. J. Towler",
  title =        "A {128Kb CMOS} static random-access memory",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "321--329",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Describes an all-CMOS 128Kb static random-access
                 memory (SRAM) with emitter-coupled logic (ECL) I/O
                 compatibility which was designed for the air-cooled
                 Enterprise System/9000 processors. Access time of 6.5
                 ns is achieved using 0.5-$\mu$m channel length and
                 1.0-$\mu$m minimum geometry. Pipelining and
                 self-resetting circuit techniques permit the chip to
                 operate with cycle time less than access time. To
                 achieve the high-reliability requirement in the TCM
                 environment, a novel technique utilizing a sacrificial
                 substrate is used to `burn in' chips prior to their
                 attachment to the TCM.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  classcodes =   "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage)",
  classification = "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage)",
  corpsource =   "IBM Gen. Technol. Div., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1.0 Micron; 1.0 micron; 128 Kbit; 6.5 ns; 6.5 Ns;
                 access time; Access time; air-cooled; Air-cooled
                 Enterprise System/9000 processors; Burn-in; burn-in;
                 circuit reliability; CMOS; CMOS integrated circuits;
                 cycle time; Cycle time; emitter-coupled logic;
                 Emitter-coupled logic; Enterprise System/9000
                 processors; I/O compatibility; memory; pipelining;
                 Pipelining; sacrificial; Sacrificial substrate;
                 self-resetting circuit; Self-resetting circuit
                 techniques; SRAM chips; static random-access; Static
                 random-access memory; substrate; TCM environment;
                 techniques",
  numericalindex = "Storage capacity 1.31E+05 bit; Time 6.5E-09 s; Size
                 1.0E-06 m",
  thesaurus =    "Circuit reliability; CMOS integrated circuits; SRAM
                 chips",
  treatment =    "A Application; P Practical",
}

@Article{Knickerbocker:1991:ISA,
  author =       "J. U. Knickerbocker and G. B. Leung and W. R. Miller
                 and S. P. Young and S. A. Sands and R. F. Indyk",
  title =        "{IBM System\slash 390} air-cooled alumina thermal
                 conduction module",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "330--341",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Advances in multilayer ceramic (MLC) processing, the
                 use of thin-film metallurgy wiring, and enhancements in
                 thermal dissipation, all described in this paper,
                 represent significant milestones in the evolution of
                 microelectronic packaging technology. The IBM
                 System/390 air-cooled alumina thermal conduction module
                 (S/390 alumina TCM) utilizes a 127.5*127.5-mm MLC
                 substrate to interconnect as many as 121 VLSI devices
                 and 144 substrate-mounted decoupling capacitors. The
                 substrate provides an array of 648 pads for solder
                 connections to each device, an array of 16 pads for
                 solder connections to each capacitor, and an array of
                 2772 pins for interconnection with the next package
                 level and contains approximately 400 m of wiring. The
                 reduced thermal resistance design permits up to 600 W
                 of air-cooling capacity. This paper describes the S/390
                 alumina TCM fabrication processes and discusses the
                 advances they represent in processing technology,
                 packaging density, and performance. Comparisons to
                 prior technology are made.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  chemicalindex = "Al2O3/sur Al2/sur Al/sur O3/sur O/sur Al2O3/bin
                 Al2/bin Al/bin O3/bin O/bin",
  classcodes =   "B0170J (Product packaging); C5490 (Other aspects)",
  classification = "B0170J (Product packaging); C5490 (Other aspects)",
  corpsource =   "IBM Gen. Technol. Div., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled module; Air-cooled module; air-cooling
                 capacity; Air-cooling capacity; Al$_2$O/sub 3/; Al/sub
                 2/O/sub 3/; capacitors; conduction module; IBM
                 computers; IBM System/390; microelectronic packaging;
                 Microelectronic packaging; MLC; MLC substrate; modules;
                 multilayer ceramic; Multilayer ceramic; package level;
                 Package level; packaging; packaging density; Packaging
                 density; resistance design; S/390 module; solder
                 connections; Solder connections; substrate;
                 substrate-mounted decoupling; Substrate-mounted
                 decoupling capacitors; thermal; Thermal conduction
                 module; thermal dissipation; Thermal dissipation;
                 Thermal resistance design; thin-film metallurgy;
                 Thin-film metallurgy wiring; VLSI; VLSI devices;
                 wiring",
  thesaurus =    "IBM computers; Modules; Packaging; VLSI",
  treatment =    "P Practical",
}

@Article{Gani:1991:IES,
  author =       "V. L. Gani and M. C. Graf and R. F. Rizzolo and W. F.
                 Washburn",
  title =        "{IBM Enterprise System\slash 9000 Type 9121} model 320
                 air-cooled processor technology",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "342--351",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The basic component of the new IBM Enterprise System
                 9000 Type 9121 Model 320 processor is an air-cooled
                 thermal conduction module (TCM). The fabrication of
                 this module required the integration of new bipolar
                 chips, CMOS SRAM chips, and ECL and DCS logic circuitry
                 in a TCM that could dissipate heat by means of air
                 cooling. The method and details of this process of
                 integration are described and discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Paughkeepsie, NY, USA",
  classcodes =   "B0170J (Product packaging); B1265B (Logic circuits);
                 B1265D (Memory circuits); C5490 (Other aspects); C5420
                 (Mainframes and minicomputers); C5120 (Logic and
                 switching circuits); C5320G (Semiconductor storage)",
  classification = "B0170J (Product packaging); B1265B (Logic circuits);
                 B1265D (Memory circuits); C5120 (Logic and switching
                 circuits); C5320G (Semiconductor storage); C5420
                 (Mainframes and minicomputers); C5490 (Other aspects)",
  corpsource =   "IBM Data Syst. Div., Paughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled thermal conduction module; Air-cooled
                 thermal conduction module; bipolar chips; Bipolar
                 chips; circuits; CMOS; CMOS SRAM chips; DCS; ECL;
                 emitter-coupled logic; IBM computers; IBM Enterprise
                 System/9000 Type 9121 Model 320 processor; integrated
                 logic; logic circuitry; Logic circuitry; mainframes;
                 modules; packaging; SRAM chips",
  thesaurus =    "Emitter-coupled logic; IBM computers; Integrated logic
                 circuits; Mainframes; Modules; Packaging; SRAM chips",
  treatment =    "P Practical",
}

@Article{Weinberger:1991:ADO,
  author =       "A. Weinberger",
  title =        "An adder design optimized for {DCS} logic",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "352--356",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The basic DCS logic gate provides a two-way SELECT
                 function and, with modifications, a two-way XOR, OR or
                 AND function. Furthermore, outputs of DCS gates can be
                 wired together (dotted) to perform dotted SELECT, XOR,
                 OR, or AND functions. The versatility of this logic is
                 illustrated in the design of a carry-lookahead adder.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Paughkeepsie, NY, USA",
  classcodes =   "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits)C5120 (Logic and switching circuits)",
  classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits); C5120 (Logic and switching circuits)",
  corpsource =   "IBM Data Syst. Div., Paughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Adder design; adder design; adders; Carry-lookahead
                 adder; carry-lookahead adder; DCS logic; DCS logic
                 gate; Differential cascade current switch; differential
                 cascade current switch; dotted functions; Dotted
                 functions; emitter-coupled logic; function; integrated
                 logic circuits; logic gates; Two-way AND function;
                 two-way AND function; two-way OR function; Two-way OR
                 function; two-way SELECT; Two-way SELECT function;
                 Two-way XOR function; two-way XOR function",
  thesaurus =    "Adders; Emitter-coupled logic; Integrated logic
                 circuits; Logic gates",
  treatment =    "P Practical",
}

@Article{Curran:1991:IES,
  author =       "B. W. Curran and M. H. Walz",
  title =        "{IBM Enterprise System\slash 9000 Type 9121} system
                 controller and memory subsystem design",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "357--366",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A system controller supporting two processors, two
                 independent memory banks, and a channel subsystem has
                 been implemented within a single air-cooled thermal
                 conduction module for the IBM Enterprise System/9000
                 Type 9121 processors. Improvements in technology
                 densities, usage of CMOS and emitter-coupled logic on
                 the same substrate, and innovations in the system
                 controller design were required to achieve the
                 one-module objective. In addition, system reliability
                 is improved with a storage key error-correction code,
                 and storage allocation options are increased with a
                 combined main/expanded store design. In conjunction
                 with the system controller development, a new memory
                 subsystem has been designed for the 9121 system.
                 Innovative large-system memory packaging techniques and
                 functional changes in the data accessing methods have
                 culminated in a memory board which supports up to
                 one-gigabyte system storage.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Kingston, NY, USA",
  classcodes =   "B1265D (Memory circuits); B2570K (Mixed technology
                 integrated circuits); C5310 (Storage system design);
                 C6120 (File organisation); C5490 (Other aspects);
                 C5320G (Semiconductor storage)",
  classification = "B1265D (Memory circuits); B2570K (Mixed technology
                 integrated circuits); C5310 (Storage system design);
                 C5320G (Semiconductor storage); C5490 (Other aspects);
                 C6120 (File organisation)",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled thermal conduction module; application
                 specific integrated circuits; channel subsystem;
                 Channel subsystem; CMOS; combined; Combined
                 main/expanded store design; data accessing methods;
                 Data accessing methods; emitter-coupled logic;
                 Emitter-coupled logic; IBM computers; IBM Enterprise;
                 IBM Enterprise System/9000 Type 9121 processors; key
                 error-correction code; main/expanded store design;
                 memory architecture; memory banks; Memory banks; memory
                 subsystem; Memory subsystem; modules; one-module
                 objective; One-module objective; packaging; Packaging
                 techniques; single; Single air-cooled thermal
                 conduction module; storage; storage allocation; Storage
                 allocation; Storage key error-correction code; storage
                 management chips; system controller; System controller;
                 System/9000 Type 9121 processors; techniques;
                 technology densities; Technology densities",
  thesaurus =    "Application specific integrated circuits; IBM
                 computers; Memory architecture; Modules; Packaging;
                 Storage allocation; Storage management chips",
  treatment =    "A Application; P Practical",
}

@Article{Slegel:1991:DPI,
  author =       "T. J. Slegel and R. J. Veracca",
  title =        "Design and performance of the {IBM Enterprise
                 System\slash 9000 Type 9121 Vector Facility}",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "367--381",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The design of the IBM Enterprise System/9000 Type 9121
                 Vector Facility is described and its performance is
                 evaluated in this paper. The Vector Facility design
                 adheres to the architecture developed for the 3090
                 vector facilities. The original design objectives and
                 associated architecture are reviewed. Vector operations
                 and design details are discussed, and specific
                 performance results are shown.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Kingston, NY, USA",
  classcodes =   "C5220P (Parallel architecture); C5470 (Performance
                 evaluation and testing)",
  classification = "C5220P (Parallel architecture); C5470 (Performance
                 evaluation and testing)",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3090 vector; 3090 Vector facilities; design
                 objectives; Design objectives; evaluation; facilities;
                 IBM computers; IBM Enterprise; IBM Enterprise
                 System/9000 Type 9121 Vector Facility; parallel
                 architectures; Parallel architectures; performance;
                 performance results; Performance results; System/9000
                 Type 9121 Vector Facility; vector operations; Vector
                 operations",
  thesaurus =    "IBM computers; Parallel architectures; Performance
                 evaluation",
  treatment =    "P Practical",
}

@Article{Turgeon:1991:TAA,
  author =       "P. R. Turgeon and A. R. Steel and M. R. Charlebois",
  title =        "Two approaches to array fault tolerance in the {IBM
                 Enterprise System\slash 9000 Type 9121} processor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "382--389",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The system design of the IBM Enterprise System/9000
                 Type 9121 processor was intended to provide high
                 performance and dense packaging within an air-cooled
                 system. Packaging and technology factors had a major
                 influence on the fault-tolerance strategies chosen.
                 This paper describes the effect that this design point
                 had on the fault-tolerance capabilities of two critical
                 9121 array applications. Although the design challenges
                 faced by these array applications initially appeared to
                 be very similar, the resulting solutions represent very
                 different designs with differing fault-tolerance
                 capabilities. The rationale for these approaches is
                 given, and the error-correction algorithms are
                 described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  classcodes =   "C5470 (Performance evaluation and testing); C5420
                 (Mainframes and minicomputers); C5320G (Semiconductor
                 storage)",
  classification = "C5320G (Semiconductor storage); C5420 (Mainframes
                 and minicomputers); C5470 (Performance evaluation and
                 testing)",
  corpsource =   "IBM Data Syst. Div., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air-cooled system; Air-cooled system; algorithms;
                 array fault tolerance; Array fault tolerance; buffer
                 storage; error-correction; Error-correction algorithms;
                 fault tolerant computing; IBM computers; IBM Enterprise
                 System/9000 Type 9121; IBM Enterprise System/9000 Type
                 9121 processor; mainframes; packaging; Packaging;
                 processor",
  thesaurus =    "Buffer storage; Fault tolerant computing; IBM
                 computers; Mainframes",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Sarma:1991:EST,
  author =       "S. Sarma",
  title =        "Enhanced self-test techniques for {VLSI} systems
                 applied to the {IBM Enterprise System\slash 9000 Type
                 9121} processor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "3",
  pages =        "390--399",
  month =        may,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper discusses the problems associated with
                 obtaining adequate test coverage from random self-test
                 for thermal conduction modules (TCMs) in the air-cooled
                 IBM Enterprise System/9000 Type 9121 processors. Each
                 9121 TCM contains approximately a quarter of a million
                 circuits. The present complexity of the TCMs made
                 previous testing methods such as chip-in-place (CIP)
                 testing enviable. The solution was to apply self-test
                 techniques to the 9121 TCMs during the manufacturing
                 process. Analytical and simulation techniques were used
                 to predict the random-pattern testability of the TCMs.
                 The results of the self-test process for the five
                 distinct 9121 processor TCMs are presented. Methods of
                 identifying and modifying random-pattern-resistant
                 logic structures are discussed. It is also proposed
                 that a hybrid approach combining random self-test with
                 deterministic test generation can be used to enhance
                 testability.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Kingston, NY, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570
                 (Semiconductor integrated circuits); B0170E (Production
                 facilities and engineering); C5130 (Microprocessor
                 chips); C5210B (Computer-aided logic design)",
  classification = "B0170E (Production facilities and engineering);
                 B1265F (Microprocessors and microcomputers); B2570
                 (Semiconductor integrated circuits); C5130
                 (Microprocessor chips); C5210B (Computer-aided logic
                 design)",
  corpsource =   "IBM Data Syst. Div., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "air cooling; Air cooling; application specific
                 integrated circuits; built-in self; deterministic test
                 generation; Deterministic test generation; Enterprise
                 System/9000 Type 9121 processor; IBM; IBM computers;
                 IBM Enterprise System/9000 Type 9121 processor; logic
                 structures; logic testing; manufacturing; Manufacturing
                 process; microprocessor chips; process; production
                 testing; random self-; Random self-test;
                 random-pattern-resistant; Random-pattern-resistant
                 logic structures; self-test techniques; Self-test
                 techniques; simulation techniques; Simulation
                 techniques; TCMs; test; thermal conduction modules;
                 Thermal conduction modules; VLSI; VLSI systems",
  thesaurus =    "Application specific integrated circuits; Built-in
                 self test; IBM computers; Logic testing; Microprocessor
                 chips; Production testing; VLSI",
  treatment =    "P Practical",
}

@Article{Pennington:1991:MNP,
  author =       "K. S. Pennington",
  title =        "Making negatives and plates for printing by
                 electroerosion: Introduction and overview",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "4",
  pages =        "458--465",
  month =        jul,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The most familiar electroerosion printers operate by
                 removing the whitish or silvery aluminum overlayer from
                 discrete areas of a special paper so as to reveal a
                 black underlayer. The direct negative/direct plate
                 (DNP) material described is a new dual-function
                 printing material which, when employed together with an
                 electroerosion printer, allows direct generation of
                 negatives or (short-run) offset printing plates
                 suitable for use in printing and publishing
                 applications. The DNP material has been specifically
                 developed for use with the IBM 4250 electroerosion
                 printer family, allowing these printers to generate
                 negatives, plates, and camera-ready copy directly from
                 the computer with no chemical processing.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  classcodes =   "B8660 (Printing industries); C5550 (Printers, plotters
                 and other hard-copy output devices)",
  classification = "B8660 (Printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "camera-ready; Camera-ready copy; copy; direct
                 negative/direct plate material; Direct negative/direct
                 plate material; dual-function printing material;
                 Dual-function printing material; electroerosion;
                 Electroerosion; etching; IBM 4250; offset printing
                 plates; Offset printing plates; printers; Printers;
                 printing; Printing; publishing; Publishing",
  thesaurus =    "Etching; Printers; Printing",
  treatment =    "G General Review; P Practical",
}

@Article{Cohen:1991:MNPa,
  author =       "M. S. Cohen and K. S. Pennington",
  title =        "Making negatives and plates for printing by
                 electroerosion. {I}. {Physical} principles",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "4",
  pages =        "466--488",
  month =        jul,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Electroerosion printing involves removal of the
                 aluminum overlayer from selected areas of a
                 black-coated paper. `Direct negatives' as well as
                 `direct plate' for use in offset lithographic printing
                 may also be generated by electroerosion if a clear
                 polymer sheet is used as the substrate instead of
                 paper, and the black base layer is omitted. If such a
                 substrate is metallized and written by electroerosion,
                 the desired direct negative is created in principle
                 since the metal stops transmitted light and the
                 polyester does not. The direct plate is simultaneously
                 created in principle since the aluminum is hydrophilic
                 and the polyester is hydrophobic. Practical realization
                 of these concepts required studies of the physical
                 principles of the processes involved, which led to
                 techniques for avoidance of mechanical scratching of
                 the aluminum film during writing. For writing, a
                 two-phase driver was used, in which the first phase
                 provided a high current for Joule heating with
                 consequent breaking of direct local aluminum-stylus
                 contacts, while the second phase provided an arc which
                 removed the remainder of the aluminum under the
                 stylus.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  chemicalindex = "Al/int Al/el",
  classcodes =   "B8660 (Printing industries); C5550 (Printers, plotters
                 and other hard-copy output devices)",
  classification = "B8660 (Printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Al film; Arc; arc; Clear polymer sheet; clear polymer
                 sheet; Electroerosion; electroerosion; etching;
                 heating; Hydrophilic; hydrophilic; Hydrophobic;
                 hydrophobic; Joule; Joule heating; lithographic
                 printing; Negatives; negatives; offset; Offset
                 lithographic printing; Plates; plates; Polyester;
                 polyester; printers; Printing; printing; Two-phase
                 driver; two-phase driver; Writing; writing",
  thesaurus =    "Etching; Printers; Printing",
  treatment =    "P Practical",
}

@Article{Cohen:1991:MNPb,
  author =       "M. S. Cohen and A. Afzali and E. E. Simonyi and M.
                 Desai and K. S. Pennington",
  title =        "Making negatives and plates for printing by
                 electroerosion. {II}. {Larger-scale} fabrication and
                 testing",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "4",
  pages =        "489--511",
  month =        jul,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "For pt.I see ibid., vol.35, no.4 p.466-88 (1991).
                 Concerns larger-scale fabrication techniques,
                 characterization methods, and the results of tests,
                 together with their interpretation. Major problems
                 which were encountered are also presented with their
                 solutions. Sheet material for the direct
                 negative/direct plate (DNP) was made by (1) Coating
                 polyester rolls with an underlayer. The underlayer
                 coating fluid contained silica, a cellulosic binder, a
                 saturated polyester dispersant, and an isocyanate
                 cross-linker. The coating fluid was carefully milled to
                 control silica particle size before coating. (2) Curing
                 the rolls either at ambient or elevated temperature.
                 (3) Calendering the underlayer. (4) Vacuum-depositing
                 an aluminum film. (5) Coating with an overlayer
                 containing graphite and a binder. Maintenance of good
                 control of material characteristics was found essential
                 for acceptable functional performance. After
                 fabrication, functional testing of the DNP material was
                 carried out on the IBM 4250 printer in order to study
                 the major performance problems of scratching, writing
                 failure, head wear, and gouging.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  classcodes =   "B8660 (Printing industries); C5550 (Printers, plotters
                 and other hard-copy output devices)",
  classification = "B8660 (Printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Calendering; calendering; Cellulosic binder;
                 cellulosic binder; Curing; curing; Direct
                 negative/direct plate; direct negative/direct plate;
                 etching; Functional performance; functional
                 performance; Gouging; gouging; Head wear; head wear;
                 IBM 4250 printer; Isocyanate cross-linker; isocyanate
                 cross-linker; Overlayer; overlayer; polyester;
                 Polyester rolls; printers; printing; rolls; Saturated
                 polyester dispersant; saturated polyester dispersant;
                 Scratching; scratching; Silica particle size; silica
                 particle size; Writing failure; writing failure",
  thesaurus =    "Etching; Printers; Printing",
  treatment =    "P Practical",
}

@Article{Cohen:1991:MNPc,
  author =       "M. S. Cohen and A. Afzali and E. E. Simonyi and K. S.
                 Pennington",
  title =        "Making negatives and plates for printing by
                 electroerosion. {III}. {Use} of the direct negative and
                 direct plate",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "4",
  pages =        "512--534",
  month =        jul,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "For pt.II see ibid., vol.35, no.4 p.489-511 (1991).
                 Issues related to the practical usage in the pressroom
                 of both the direct negative and direct plate are
                 discussed. Two concerns associated with the usage of
                 the direct negative during platemaking are treated: (1)
                 the effect of light transmission through defects
                 (voids) in the aluminum film, and (2) the effect of
                 light transmission directly through the aluminum. These
                 concerns may be addressed respectively by careful
                 fabrication of the material and careful control of the
                 exposure conditions during platemaking. Two aspects of
                 the usage of the direct plate are considered: (1) the
                 need for a simple prepress `activation' treatment, and
                 (2) press-life limitation caused by wear of the direct
                 plate on the press. Passing a direct plate through an
                 activator solution immediately prior to mounting it on
                 the press prevented scumming in the image area and
                 blinding in the background (nonimage) area. The life on
                 the press of the direct plate is limited by the wearing
                 away of the aluminum from the background areas, thereby
                 causing scumming. Changes in the structure of the
                 direct plate which could prolong press life were
                 investigated.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  chemicalindex = "Al/int Al/el",
  classcodes =   "B8660 (Printing industries); C5550 (Printers, plotters
                 and other hard-copy output devices)",
  classification = "B8660 (Printing industries); C5550 (Printers,
                 plotters and other hard-copy output devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Centre, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Al film; direct; Direct negative; direct negative;
                 Direct plate; Electroerosion; electroerosion; etching;
                 Exposure conditions; exposure conditions; Image area;
                 image area; Light transmission; light transmission;
                 plate; Platemaking; platemaking; Press-life limitation;
                 press-life limitation; Pressroom; pressroom; printers;
                 Printing; printing; Scumming; scumming; Wear; wear",
  thesaurus =    "Etching; Light transmission; Printers; Printing",
  treatment =    "P Practical",
}

@Article{Musgrave:1991:AFL,
  author =       "F. K. Musgrave and B. B. Mandelbrot",
  title =        "The art of fractal landscapes",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "4",
  pages =        "535--536, 539",
  month =        jul,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Synthetic images of fractal landscapes have moved
                 beyond science to enter the domain of `art for art's
                 sake'. The authors discuss some of the ramifications of
                 this artistic aspect: improving the fractal description
                 of terrains, adding fractal textures to surfaces, and
                 using parallel computers. They illuminate the
                 peculiarities of attaining artistic self-expression in
                 representational imagery purely through formal logic,
                 and discuss its import.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Comput. Sci. and Math., Yale Univ., New
                 Haven, CT, USA",
  classcodes =   "C7820 (Humanities); C6130B (Graphics techniques)",
  classification = "C6130B (Graphics techniques); C7820 (Humanities)",
  corpsource =   "Dept. of Comput. Sci. and Math., Yale Univ., New
                 Haven, CT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Art; art; Artistic self-expression; artistic
                 self-expression; computer graphics; Formal logic;
                 formal logic; fractal; fractal landscapes; Fractal
                 landscapes; Fractal textures; fractals; Parallel
                 computers; parallel computers; representational
                 imagery; Representational imagery; synthetic images;
                 Synthetic images; terrains; Terrains; textures",
  thesaurus =    "Art; Computer graphics; Fractals",
  treatment =    "A Application; P Practical",
}

@Article{Kleinfelder:1991:PPP,
  author =       "W. Kleinfelder",
  title =        "Preface: Papers on Parallel Processing",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "571--572",
  month =        sep,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Shea:1991:IVV,
  author =       "D. G. Shea and W. W. Wilcke and R. C. Booth and D. H.
                 Brown and Z. D. Christidis and M. E. Giampapa and G. B.
                 Irwin and T. T. Murakami and V. K. Naik and F. T. Tong
                 and P. R. Varker and D. J. Zukowski",
  title =        "The {IBM Victor V256} partitionable multiprocessor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "573--590",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Victor V256 is a partitionable message-passing
                 multiprocessor with 256 processors, designed and in use
                 at the IBM Thomas J. Watson Research Center. The goals
                 are to explore computer architectures based on the
                 message-passing model and to use these architectures to
                 solve real applications. The authors present the
                 architecture of the Victor system, particularly its
                 partitioning and nonintrusive monitoring. They discuss
                 some of the programming environments on Victor, such as
                 E-kernel, an embedding kernel developed for the support
                 of program mapping and network reconfiguration. They
                 review applications developed and run on Victor and
                 discuss a few in depth, concluding with insights gained
                 from this project.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C5220P
                 (Parallel architecture)",
  classification = "C5220P (Parallel architecture); C5440
                 (Multiprocessor systems and techniques)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architectures; Computer architectures; computer
                 architectures; E-kernel; embedding; Embedding kernel;
                 IBM computers; kernel; monitoring; multiprocessing
                 systems; Network reconfiguration; network
                 reconfiguration; nonintrusive; Nonintrusive monitoring;
                 parallel; Partitionable message-passing multiprocessor;
                 partitionable message-passing multiprocessor;
                 Partitioning; partitioning; Program mapping; program
                 mapping; Programming environments; programming
                 environments; Victor V256",
  thesaurus =    "IBM computers; Multiprocessing systems; Parallel
                 architectures",
  treatment =    "P Practical",
}

@Article{Shimizu:1991:DCT,
  author =       "S. Shimizu and N. Oba and T. Nakada and M. Ohara and
                 A. Moriwaki",
  title =        "Design choices for the {TOP}-1 multiprocessor
                 workstation",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "591--602",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A snoopy-cache-based multiprocessor workstation called
                 TOP-1 (Tokyo research parallel processor-1) was
                 developed to evaluate multiprocessor architecture
                 design choices as well as to conduct research on
                 operating systems, compilers, and applications for
                 multiprocessor workstations. TOP-1 is a ten-way
                 multiprocessor using the Intel 80386 microprocessor
                 chip and the Weitek WTL 1167 floating-point coprocessor
                 chip. It is currently running under a multiprocessor
                 version of AIX. Research interest was focused on the
                 design of an effective snoopy cache (all caches monitor
                 all memory-cache traffic) system and the quantitative
                 evaluation of its performance. One of the unique
                 aspects of the TOP-1 design is that the cache supports
                 four different, original snoopy protocols, which may
                 coexist in the system. To evaluate the performance, the
                 authors implemented a hardware statistics monitor that
                 gathers statistical data. The paper focuses mainly on
                 the TOP-1 cache design-its protocol, and its evaluation
                 by means of the statistics monitor.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Tokyo Res. Lab., IBM Japan Ltd.,
                 Japan",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C5470
                 (Performance evaluation and testing)",
  classification = "C5440 (Multiprocessor systems and techniques); C5470
                 (Performance evaluation and testing)",
  corpsource =   "IBM Res. Div., Tokyo Res. Lab., IBM Japan Ltd.,
                 Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AIX; buffer storage; chip; Compilers; compilers;
                 development systems; Hardware statistics monitor;
                 hardware statistics monitor; IBM; IBM computers; Intel
                 80386 microprocessor; Intel 80386 microprocessor chip;
                 multiprocessing systems; multiprocessor; Multiprocessor
                 architecture design choices; multiprocessor
                 architecture design choices; Multiprocessor
                 workstation; multiprocessor workstation; Operating
                 systems; operating systems; performance evaluation;
                 Snoopy protocols; snoopy protocols; snoopy-cache-based;
                 Snoopy-cache-based multiprocessor; TOP-1; Weitek WTL
                 1167 floating-point coprocessor chip; workstations",
  thesaurus =    "Buffer storage; Development systems; IBM computers;
                 Multiprocessing systems; Performance evaluation;
                 Workstations",
  treatment =    "P Practical",
}

@Article{Franaszek:1991:HIM,
  author =       "P. A. Franaszek and C. J. Georgiou and A. N. Tantawi",
  title =        "Hierarchically interconnected multiprocessors",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "603--616",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The design of interconnection networks is a central
                 problem in parallel computing, especially for
                 shared-memory systems, where network latency, or delay,
                 is one factor that limits system size. The paper
                 discusses aspects of one particular approach to network
                 structure, a design comprising a multiplicity of
                 subnetworks that form a hierarchy of paths. The
                 hierarchy includes fast paths that are used in the
                 absence of contention, and alternate paths with
                 contention resolution. That is, just as in the case of
                 a memory hierarchy, the fastest component of the
                 hierarchy that can provide the desired function is
                 utilized at a given time. The viability and robustness
                 of hierarchical networks is studied first by examining
                 circuit and implementation issues, and then by
                 considering performance modelling and analysis. The
                 overall performance of the hierarchy is shown to be
                 close to that of a contention-free network of fast
                 paths.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C4230M (Multiprocessor interconnection); C5220P
                 (Parallel architecture)",
  classification = "C4230M (Multiprocessor interconnection); C5220P
                 (Parallel architecture)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computing; contention-; Contention-free network;
                 Delay; delay; delays; free network; Hierarchical
                 networks; hierarchical networks; Interconnection
                 networks; interconnection networks; multiprocessor
                 interconnection networks; Network latency; network
                 latency; parallel; Parallel computing; Parallel
                 machines; parallel machines; Performance modelling;
                 performance modelling; Shared-memory systems;
                 shared-memory systems",
  thesaurus =    "Delays; Multiprocessor interconnection networks",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Bryant:1991:OSS,
  author =       "R. M. Bryant and H.-Y. Chang and B. S. Rosenburg",
  title =        "Operating system support for parallel programming on
                 {RP3}",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "617--634",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "RP3, the Research Parallel Processing Prototype, was a
                 research vehicle for exploring the hardware and
                 software aspects of highly parallel computation. RP3
                 was a shared-memory machine that was designed to be
                 scalable to 512 processors; a 64-processor machine was
                 in operation from October 1988 through March 1991. A
                 parallel-programming environment based on the Mach
                 operating system was developed, and a variety of
                 programming models were tested on the machine. To help
                 user programs realize the full potential of parallelism
                 on RP3, the RP3 operating system was extended to
                 support such RP3 architectural features as noncoherent
                 caches, local and interleaved storage, and a hardware
                 performance monitor. The system included explicit
                 job-scheduling and processor-allocation facilities,
                 facilities for exploiting the RP3 memory hierarchy, and
                 performance-data collection and logging facilities. The
                 paper describes these components of the RP3 operating
                 system, provides the rationale for the design decisions
                 that were made, and discusses the implementation of
                 these operating system facilities.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6150N (Distributed systems); C6150J (Operating
                 systems); C6110P (Parallel programming); C6115
                 (Programming support)",
  classification = "C6110P (Parallel programming); C6115 (Programming
                 support); C6150J (Operating systems); C6150N
                 (Distributed systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "allocation; Explicit job-scheduling; explicit
                 job-scheduling; hardware performance; Hardware
                 performance monitor; Mach operating system; monitor;
                 multiprocessing programs; Noncoherent caches;
                 noncoherent caches; operating systems (computers);
                 Parallel programming; parallel programming;
                 Processor-allocation; processor-allocation; programming
                 environments; Programming models; programming models;
                 Prototype; Research Parallel Processing; Research
                 Parallel Processing Prototype; resource; RP3;
                 scheduling; Shared-memory machine; shared-memory
                 machine",
  thesaurus =    "Multiprocessing programs; Operating systems
                 [computers]; Parallel programming; Programming
                 environments; Resource allocation; Scheduling",
  treatment =    "P Practical",
}

@Article{Kimelman:1991:RPV,
  author =       "D. N. Kimelman and T. A. Ngo",
  title =        "The {RP3} program visualization environment",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "635--651",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The performance promised for parallel systems often
                 proves to be somewhat elusive. The paper discusses one
                 important technique for improving the performance of
                 parallel software: program visualization-helping
                 programmers visualize the real behavior of an
                 application or system by presenting its state and
                 progress in a continuous graphic fashion. An
                 environment for visualization of program execution is
                 described. Within this visualization environment,
                 programmers dynamically establish views of the behavior
                 of a program in execution and watch for trends,
                 anomalies, and correlations as information is
                 displayed. By continually refining the view of the
                 program and replaying the execution of the program,
                 programmers can gain an understanding of program
                 (mis)behavior. This is essential for the debugging,
                 performance analysis, and tuning of parallel software.
                 Results from visualization of systems and applications
                 running on the RP3, an experimental shared-memory
                 multiprocessor, are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6110P (Parallel programming); C6150N (Distributed
                 systems); C6115 (Programming support); C6150G
                 (Diagnostic, testing, debugging and evaluating
                 systems)",
  classification = "C6110P (Parallel programming); C6115 (Programming
                 support); C6150G (Diagnostic, testing, debugging and
                 evaluating systems); C6150N (Distributed systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Debugging; debugging; environments; multiprocessor;
                 parallel programming; Parallel software; parallel
                 software; Performance analysis; performance analysis;
                 program diagnostics; programming; RP3 program
                 visualization environment; shared-memory; Shared-memory
                 multiprocessor; Tuning; tuning; visual programming",
  thesaurus =    "Parallel programming; Program diagnostics; Programming
                 environments; Visual programming",
  treatment =    "P Practical",
}

@Article{Ammann:1991:PPC,
  author =       "E. M. Ammann and R. R. Berbec and G. Bozman and M.
                 Faix and G. A. Goldrian and J. A. {Pershing, Jr.} and
                 J. Ruvolo-Chong and F. Scholz",
  title =        "The {Parallel Processing Compute Server}",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "653--666",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The Parallel Processing Compute Server (PPCS) is a
                 distributed-memory multiprocessing system consisting of
                 System/370 microprocessors (33 at present)
                 interconnected through a matrix switch. The paper
                 describes the hardware configuration, the extensions to
                 the System/370 instruction set that are provided to
                 support the distributed memory and interprocessor
                 signaling, the modifications to the VM/SP operating
                 system that allow it to run effectively on many closely
                 coupled processors (most of which have no disks), and
                 the application-support layer, which permits FORTRAN
                 programs to take advantage of the highly parallel
                 environment. Development of the PPCS is a joint effort
                 of the IBM Boblingen Development Laboratory and the IBM
                 Thomas J. Watson Research Center. A prototype PPCS has
                 been installed at CERN.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Data Syst. Div., Dev. Lab., Boblingen, Germany",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C6150N
                 (Distributed systems); C6110P (Parallel programming)",
  classification = "C5440 (Multiprocessor systems and techniques);
                 C6110P (Parallel programming); C6150N (Distributed
                 systems)",
  corpsource =   "IBM Data Syst. Div., Dev. Lab., Boblingen, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application-support layer; Application-support layer;
                 CERN; distributed-memory; Distributed-memory
                 multiprocessing system; FORTRAN; FORTRAN programs; IBM
                 computers; instruction set; Instruction set;
                 instruction sets; interprocessor signaling;
                 Interprocessor signaling; matrix; Matrix switch;
                 multiprocessing system; multiprocessing systems;
                 operating system; operating systems (computers);
                 parallel environment; Parallel environment; Parallel
                 Processing Compute Server; parallel programming; PPCS;
                 programs; switch; System/370 microprocessors; VM/SP;
                 VM/SP operating system",
  thesaurus =    "IBM computers; Instruction sets; Multiprocessing
                 systems; Operating systems [computers]; Parallel
                 programming",
  treatment =    "P Practical",
}

@Article{Scarborough:1991:CIE,
  author =       "L. J. Scarborough and R. G. Scarborough and S. W.
                 White",
  title =        "Clustering {IBM Enterprise System\slash 3090}
                 computers for parallel execution of {FORTRAN}
                 programs",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "667--679",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Two IBM Enterprise System/3090 Model 600J computer
                 systems, each with six processors capable of executing
                 vector and scalar instructions, have been connected
                 into a cluster for parallel execution of single FORTRAN
                 programs. The clustering is achieved through a
                 combination of software and hardware. When enabled for
                 parallel execution and allowed to use all twelve
                 processors in the cluster, FORTRAN programs have run as
                 much as 11.7 times faster than when run on a single
                 processor. The combined hardware and software
                 technology is called IBM Clustered FORTRAN. It was
                 achieved by modifying existing technology quickly to
                 provide new capabilities. The paper discusses the
                 modifications and the motivations behind them. It
                 summarizes the performance of several applications
                 executed with Clustered FORTRAN. Finally, it describes
                 how clustering has been used to improve performance in
                 novel ways.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Sci. Center, Palo Alto, CA, USA",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C6110P
                 (Parallel programming); C6150N (Distributed systems);
                 C6140D (High level languages)",
  classification = "C5440 (Multiprocessor systems and techniques);
                 C6110P (Parallel programming); C6140D (High level
                 languages); C6150N (Distributed systems)",
  corpsource =   "IBM Sci. Center, Palo Alto, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "execution; FORTRAN; FORTRAN programs; IBM Clustered
                 FORTRAN; IBM computers; IBM Enterprise System/3090;
                 multiprocessing programs; multiprocessing systems;
                 parallel; Parallel execution; parallel programming;
                 purpose computers; special",
  thesaurus =    "FORTRAN; IBM computers; Multiprocessing programs;
                 Multiprocessing systems; Parallel programming; Special
                 purpose computers",
  treatment =    "P Practical",
}

@Article{Lorie:1991:EDP,
  author =       "R. A. Lorie and J.-J. Daudenarde and J. W. Stamos and
                 H. C. Young",
  title =        "Exploiting database parallelism in a message-passing
                 multiprocessor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "681--695",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Parallel processing may well be the only means of
                 satisfying the long-term performance requirements for
                 database systems: an increase in throughput for
                 transactions and a drastic decrease in response time
                 for complex queries. The authors review various
                 alternatives, and then focus entirely on exploiting
                 parallel-processing configurations in which
                 general-purpose processors communicate only via message
                 passing. The database is partitioned among the
                 processors. This approach looks promising but offers
                 challenging problems. The paper reports on solutions to
                 some of them: how to express strategies for efficiently
                 executing complex queries, how to minimize overhead in
                 operations such as parallel joins and sorts, and how to
                 deal with transaction management in a highly
                 distributed system. The paper ends with a discussion of
                 the lessons learned from exercising a prototype
                 developed in IBM Research.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  classcodes =   "C6160B (Distributed DBMS); C6110P (Parallel
                 programming)",
  classification = "C6110P (Parallel programming); C6160B (Distributed
                 DBMS)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Complex queries; complex queries; Database
                 parallelism; database parallelism; distributed
                 databases; Distributed system; distributed system; IBM;
                 IBM Research; Message-passing multiprocessor;
                 message-passing multiprocessor; multiprocessing
                 systems; Overhead; overhead; parallel; Parallel joins;
                 parallel joins; programming; Research; Response time;
                 response time; Sorts; sorts; Transaction management;
                 transaction management; transaction processing",
  thesaurus =    "Distributed databases; Multiprocessing systems;
                 Parallel programming; Transaction processing",
  treatment =    "P Practical",
}

@Article{Reuter:1991:MSB,
  author =       "R. Reuter and U. Scharffenberger and J. Schule",
  title =        "Multiplication of a symmetric banded matrix by a
                 vector on a vector multiprocessor computer",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "697--706",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes how to vectorize and parallelize
                 the multiplication of a symmetric banded matrix by a
                 vector, on a vector multiprocessor. The ideas presented
                 involve two packed-band-storage schemes, and
                 implementations for both schemes are studied. The best
                 among the uniprocessor solutions proposed achieves a
                 maximum of 37.1 Mflops on an IBM Enterprise System/3090
                 400E with Vector Facility (VF). For one of the schemes,
                 a parallel implementation on an IBM 3090 VF
                 multiprocessor is presented, and time measurements are
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Germany, Heidelberg Sci. Center, Germany",
  classcodes =   "C4140 (Linear algebra); C4240P (Parallel programming
                 and algorithm theory)",
  classification = "C4140 (Linear algebra); C4240P (Parallel programming
                 and algorithm theory)",
  corpsource =   "IBM Germany, Heidelberg Sci. Center, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "37.1 MFLOPS; IBM 3090 VF; IBM 3090 VF multiprocessor;
                 IBM Enterprise; IBM Enterprise System/3090 400E; matrix
                 algebra; Multiplication; multiplication;
                 multiprocessor; Packed-band-storage schemes;
                 packed-band-storage schemes; parallel algorithms;
                 pipeline processing; Symmetric banded matrix; symmetric
                 banded matrix; System/3090 400E; Time measurements;
                 time measurements; Vector facility; vector facility;
                 Vector multiprocessor computer; vector multiprocessor
                 computer",
  numericalindex = "Computer speed 3.71E+07 FLOPS",
  thesaurus =    "Matrix algebra; Parallel algorithms; Pipeline
                 processing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Johnson:1991:WBC,
  author =       "T. A. Johnson and D. J. Zukowski",
  title =        "Waveform-relaxation based circuit simulation on the
                 {Victor V256} parallel processor",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "707--720",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Present-day circuit-analysis tools permit designers to
                 verify performance for circuits consisting of up to
                 10000 transistors. However, current designs often
                 exceed several tens of thousands and even hundreds of
                 thousands of transistors. The gap between the number of
                 transistors that can be simulated and the number per
                 design inhibits proper analysis prior to manufacturing,
                 yet incomplete analysis often overlooks design flaws
                 and forces redesign, resulting in increased costs and
                 longer development times. This gap is expected to widen
                 in the foreseeable future. To help close the
                 ever-increasing simulation/design gap, the authors have
                 developed an experimental parallel circuit simulator,
                 WR V256, for the Victor V256 distributed-memory
                 parallel processor. WR V256 has been used to analyze
                 circuits from fewer than 300 to more than 180000
                 MOSFETs. WR V256 was originally based on a
                 Gauss--Seidel relaxation algorithm, which was later
                 replaced with a bounded-chaotic one in order to achieve
                 good parallel speedups for a wider variety of circuits.
                 At this time, speedups of up to 190 have been observed
                 for large circuits.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2560R (Insulated gate field effect transistors);
                 B1130B (Computer-aided circuit analysis and design);
                 B2570F (Other MOS integrated circuits); C7410D
                 (Electronic engineering)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B2560R (Insulated gate field effect transistors);
                 B2570F (Other MOS integrated circuits); C7410D
                 (Electronic engineering)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bounded chaotic relaxation; bounded chaotic
                 relaxation; circuit analysis computing; circuit
                 simulator; Circuit-analysis tools; circuit-analysis
                 tools; Design flaws; design flaws; distributed-memory
                 parallel; Distributed-memory parallel processor;
                 Gauss--Seidel relaxation; insulated gate field effect;
                 MOS integrated circuits; MOSFETs; parallel; Parallel
                 circuit simulator; parallel processing; processor;
                 transistors; Victor V256 parallel; Victor V256 parallel
                 processor; VLSI; WR V256",
  thesaurus =    "Circuit analysis computing; Insulated gate field
                 effect transistors; MOS integrated circuits; Parallel
                 processing; VLSI",
  treatment =    "P Practical",
}

@Article{Flatt:1991:FRU,
  author =       "H. P. Flatt",
  title =        "Further results using the overhead model for parallel
                 systems",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "721--726",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A performance model that takes into consideration the
                 overhead incurred in the use of a parallel system is
                 used to show that the maximum value of the speedup
                 achieved by the parallel system for a fixed problem may
                 be much smaller than the number of processors required
                 to achieve that value. It is also shown that under
                 certain conditions, the problem size may be varied so
                 as to achieve a speedup closely approximating the
                 number of processors used.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5470 (Performance evaluation and testing); C5440
                 (Multiprocessor systems and techniques)",
  classification = "C5440 (Multiprocessor systems and techniques); C5470
                 (Performance evaluation and testing)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Amdahl model; model; Overhead; overhead; Overhead
                 model; overhead model; parallel machines; Parallel
                 systems; parallel systems; performance; performance
                 evaluation; Performance model; Problem size; problem
                 size",
  thesaurus =    "Parallel machines; Performance evaluation",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Canetti:1991:PCP,
  author =       "R. Canetti and L. P. Fertig and S. A. Kravitz and D.
                 Malki and R. Y. Pinter and S. Porat and A. Teperman",
  title =        "The parallel {C} ({pC}) programming language",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "727--741",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors describe pC (parallel C), an extension of
                 the ANSI C programming language to support medium- to
                 large-grain parallel programming in both shared- and
                 distributed-memory environments. pC aims to make
                 programming for parallel processors accessible to the C
                 community by enriching the C programming model with a
                 small set of constructs supporting parallelism. pC
                 supports shared- and distributed-memory environments
                 via a hierarchical computational model. A pC
                 application comprises a static collection of tasks with
                 disjoint memory spaces. A dynamic collection of threads
                 runs within each task, sharing the data and code of the
                 task. Language constructs specify concurrent execution
                 of threads within a single task. Additional language
                 constructs specify the interactions between threads
                 through the following mechanisms: initiation of threads
                 in remote tasks by remote function call, mailbox-based
                 message passing, and synchronization primitives. The
                 paper introduces the computational model and language
                 constructs of pC and describes a prototype pC compiler
                 and run-time system for the Mach operating system.
                 Several program examples illustrate the utility of pC
                 constructs.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Comput. Sci., Technion-Israel Inst. of
                 Technol., Haifa, Israel",
  classcodes =   "C6140D (High level languages); C6110P (Parallel
                 programming); C6150C (Compilers, interpreters and other
                 processors)",
  classification = "C6110P (Parallel programming); C6140D (High level
                 languages); C6150C (Compilers, interpreters and other
                 processors)",
  corpsource =   "Dept. of Comput. Sci., Technion-Israel Inst. of
                 Technol., Haifa, Israel",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ANSI C programming language; C language; C
                 programming; C programming model; Disjoint memory
                 spaces; disjoint memory spaces; Distributed-memory;
                 distributed-memory; function call; Hierarchical
                 computational model; hierarchical computational model;
                 Language constructs; language constructs; Mach; Mach
                 operating system; Mailbox-based message passing;
                 mailbox-based message passing; model; operating system;
                 Parallel C; parallel C; parallel languages; Parallel
                 programming; parallel programming; Parallelism;
                 parallelism; PC; pC; PC compiler; pC compiler; program
                 compilers; remote; Remote function call; Run-time
                 system; run-time system; Shared memory; shared memory;
                 Synchronization; synchronization; Tasks; tasks;
                 Threads; threads",
  thesaurus =    "C language; Parallel languages; Program compilers",
  treatment =    "P Practical",
}

@Article{Hummel:1991:LSN,
  author =       "S. F. Hummel and E. Schonberg",
  title =        "Low-overhead scheduling of nested parallelism",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "743--765",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Nested parallelism has the potential not only to
                 permit more parallelism than non-nested parallelism,
                 but to result in better load balancing. However, nested
                 parallelism will not be profitable unless the overhead
                 of scheduling nested parallel constructs can be made
                 nonprohibitive. Previous implementations of nested
                 parallel constructs have been fairly expensive and
                 therefore have not been able to exploit fine-grained
                 nested parallelism. The authors describe a run-time
                 system that schedules a large subset of nested parallel
                 constructs-those that run until completion without
                 blocking-with very little overhead. The run-time system
                 is built around a novel scheduling policy and work
                 queue. The scheduling policy permits efficient
                 stack-based local-memory storage allocation for task
                 data, which is particularly efficient for
                 multiprocessor architectures with both shared and local
                 memory, such as the RP3. The shared, nonlocking work
                 queue allows processors to obtain tasks in just a few
                 instructions, without sacrificing load balancing.",
  acknowledgement = ack-nhfb,
  affiliation =  "Sch. of Comput. Sci. and Electr. Eng., Polytech.
                 Univ., New York, NY, USA",
  classcodes =   "C6150N (Distributed systems); C6110P (Parallel
                 programming)",
  classification = "C6110P (Parallel programming); C6150N (Distributed
                 systems)",
  corpsource =   "Sch. of Comput. Sci. and Electr. Eng., Polytech.
                 Univ., New York, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "allocation; data; Fine-grained nested parallelism;
                 fine-grained nested parallelism; Load balancing; load
                 balancing; multiprocessing programs; Multiprocessor
                 architectures; multiprocessor architectures; Nested
                 parallelism; nested parallelism; Overhead; overhead;
                 parallel programming; queue; resource; RP3; Run-time
                 system; run-time system; Scheduling; scheduling;
                 Stack-based local-memory storage allocation;
                 stack-based local-memory storage allocation; task; Task
                 data; work; Work queue",
  thesaurus =    "Multiprocessing programs; Parallel programming;
                 Resource allocation; Scheduling",
  treatment =    "P Practical",
}

@Article{Ching:1991:EAP,
  author =       "W.-M. Ching and D. Ju",
  title =        "Execution of automatically parallelized {APL} programs
                 on {RP3}",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "767--777",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors have implemented an experimental APL/C
                 compiler, which accepts ordinary APL programs and
                 produces C programs. They have also implemented a
                 run-time environment that supports the parallel
                 execution of these C programs on the RP3 computer, a
                 shared-memory, 64-way MIMD machine built at the IBM
                 Thomas J. Watson Research Center. The APL/C compiler
                 uses the front end of the APL/370 compiler and imposes
                 the same restrictions, but requires no parallelization
                 directives from the user. The run-time environment is
                 based on simple synchronization primitives and is
                 implemented using Mach threads. They report the
                 speedups of several compiled programs running on RP3
                 under the Mach operating system. The current
                 implementation exploits only data parallelism. They
                 discuss the relationship between the style of an APL
                 program and its expected benefit from the automatic
                 parallel execution provided by the compiler.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C6150C (Compilers, interpreters and other processors);
                 C6150N (Distributed systems); C6140D (High level
                 languages)",
  classification = "C6140D (High level languages); C6150C (Compilers,
                 interpreters and other processors); C6150N (Distributed
                 systems)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "APL; APL/370 compiler; APL/C; APL/C compiler;
                 Automatically parallelized APL programs; automatically
                 parallelized APL programs; C language; C programs;
                 compiler; compilers; Data parallelism; data
                 parallelism; Mach operating; Mach operating system;
                 Mach threads; multiprocessing programs; program; RP3;
                 Shared-memory; shared-memory; synchronisation;
                 Synchronization primitives; synchronization primitives;
                 system",
  thesaurus =    "APL; C language; Multiprocessing programs; Program
                 compilers; Synchronisation",
  treatment =    "P Practical",
}

@Article{Sarkar:1991:APP,
  author =       "V. Sarkar",
  title =        "Automatic partitioning of a program dependence graph
                 into parallel tasks",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "779--804",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The author describes a general interprocedural
                 framework for partitioning a program dependence graph
                 into parallel tasks for execution on a multiprocessor
                 system. Partitioning techniques are necessary to
                 execute a parallel program at the appropriate
                 granularity for a given target multiprocessor. The
                 problem is to determine the best trade-off between
                 parallelism and overhead. It is desirable for the
                 partitioning to be performed automatically, so that the
                 programmer can write a parallel program without being
                 burdened by details of the overhead target
                 multiprocessor, and so that the same parallel program
                 can be made to execute efficiently on different
                 multiprocessors. For each procedure, the partitioning
                 algorithm attempts to minimize the estimated parallel
                 execution time. The estimated parallel execution time
                 reflects a trade-off between parallelism and overhead
                 and is minimized at an optimal intermediate granularity
                 of parallelism. Execution-profiling information is used
                 to obtain accurate execution-time estimates. The
                 partitioning framework has been completely implemented
                 in the PTRAN system at the IBM Thomas J. Watson
                 Research Center. Partitioned parallel programs
                 generated by this prototype system have been executed
                 on the IBM 3090 and RP3 multiprocessor systems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Palo Alto Sci. Center, CA, USA",
  classcodes =   "C6150N (Distributed systems); C6110P (Parallel
                 programming)",
  classification = "C6110P (Parallel programming); C6150N (Distributed
                 systems)",
  corpsource =   "IBM Palo Alto Sci. Center, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Execution profiling; execution profiling;
                 Execution-time estimates; execution-time estimates;
                 Granularity; granularity; IBM 3090; Interprocedural
                 framework; interprocedural framework; multiprocessing
                 programs; Multiprocessor system; multiprocessor system;
                 multiprocessor systems; Overhead; overhead; parallel;
                 Parallel execution time; parallel execution time;
                 Parallel program; parallel program; parallel
                 programming; Parallel tasks; Parallelism; parallelism;
                 Partitioning framework; partitioning framework; Program
                 dependence graph; program dependence graph; PTRAN
                 system; RP3; RP3 multiprocessor systems; tasks",
  thesaurus =    "Multiprocessing programs; Parallel programming",
  treatment =    "B Bibliography; P Practical",
}

@Article{Irvin:1991:MPC,
  author =       "D. R. Irvin",
  title =        "Monitoring the performance of commercial {T1}-rate
                 transmission service",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "805--814",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper gathers the scattered empirical and
                 theoretical elements of the performance-management
                 problem for commercial T1-rate transmission service and
                 integrates these elements in a useful way. The author
                 proposes two variants of a time-based
                 performance-monitoring algorithm that are insensitive
                 to the arrival pattern of transmission errors. The
                 first variant compares a count of errored seconds
                 accumulated over an interval of time to a fixed
                 threshold, and issues an alert to the network operator
                 indicating degraded transmission performance whenever
                 the count exceeds the threshold before the measurement
                 interval expires. The fixed-threshold test is
                 calibrated with reference to the well-known Neyman
                 model of transmission errors on metallic-conductor
                 systems. This calibration is then shown to be suitable
                 as well for monitoring the performance of fiber-optic
                 transmission systems where errored seconds follow the
                 cumulative binomial distribution. The second variant of
                 the new performance-monitoring algorithm replaces the
                 fixed-threshold test with a dual-threshold test having
                 a lower threshold that remains fixed and a higher
                 threshold that floats in response to changes in error
                 characteristics. An analysis based on the difference
                 equations that describe the movement of the floating
                 threshold shows that the dual-threshold test is more
                 responsive than the fixed-threshold test in detecting
                 nonstationary trends toward degraded transmission and
                 in detecting stable but mediocre performance levels.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Networking Syst., Emerging Carrier Technol.,
                 Research Triangle Park, NC, USA",
  classcodes =   "B6210C (Network management)",
  classification = "B6210C (Network management)",
  corpsource =   "IBM Networking Syst., Emerging Carrier Technol.,
                 Research Triangle Park, NC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Arrival pattern; arrival pattern; conductor systems;
                 data communication systems; degraded transmission;
                 Degraded transmission performance; Difference
                 equations; difference equations; digital communication
                 systems; Fiber-optic transmission systems; fiber-optic
                 transmission systems; Fixed-threshold test;
                 fixed-threshold test; Floating threshold; floating
                 threshold; management; metallic-; Metallic-conductor
                 systems; Neyman model; performance; performance
                 evaluation; performance-management;
                 Performance-management problem; problem; T1-rate
                 transmission service; telecommunication network;
                 telecommunication services; Time-based
                 performance-monitoring algorithm; time-based
                 performance-monitoring algorithm; Transmission errors;
                 transmission errors",
  thesaurus =    "Data communication systems; Digital communication
                 systems; Performance evaluation; Telecommunication
                 network management; Telecommunication services",
  treatment =    "P Practical",
}

@Article{Bozman:1991:TSC,
  author =       "G. P. Bozman and H. H. Ghannad and E. D. Weinberger",
  title =        "A trace-driven study of {CMS} file references",
  journal =      j-IBM-JRD,
  volume =       "35",
  number =       "5/6",
  pages =        "815--828",
  month =        sep # "\slash " # nov,
  year =         "1991",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper presents a detailed study of file reference
                 patterns by users of a VM/CMS interactive system. The
                 data were collected from two different IBM locations
                 via CMON, a CMS monitoring facility. The authors
                 present background information about the CMS file
                 system, the CMON program, and data-reduction programs,
                 as well as a discussion of the results. Some earlier
                 studies of this type have been restricted to a static
                 analysis of the existing files. However, as is shown, a
                 static analysis does not reliably reflect dynamic file
                 reference behavior. By using both static statistics and
                 dynamic statistics, it is possible to better understand
                 how file systems are used, to evaluate possible
                 changes, and to provide distribution parameters for
                 modeling. More recent studies of other interactive
                 systems have measured dynamic activity patterns. They
                 compare results with these when appropriate.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "C6150J (Operating systems); C6120 (File
                 organisation)",
  classification = "C6120 (File organisation); C6150J (Operating
                 systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(computers); CMON; CMS file references; CMS monitoring
                 facility; data reduction; Data-reduction programs;
                 data-reduction programs; distribution; Distribution
                 parameters; dynamic; Dynamic file reference behavior;
                 Dynamic statistics; dynamic statistics; file
                 organisation; file reference; file reference behavior;
                 File reference patterns; IBM locations; Interactive
                 systems; interactive systems; operating systems;
                 parameters; patterns; Trace-driven analysis;
                 trace-driven analysis; VM/CMS interactive system",
  thesaurus =    "Data reduction; File organisation; Operating systems
                 [computers]",
  treatment =    "P Practical",
}

@Article{McGroddy:1992:PPT,
  author =       "J. C. McGroddy",
  title =        "Preface: Papers on Thin-Film-Transistor Liquid-Crystal
                 Display Technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "2--2",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
}

@Article{Howard:1992:TFT,
  author =       "W. E. Howard",
  title =        "Thin-film-transistor\slash liquid crystal display
                 technology --- an introduction",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "3--10",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Liquid crystals are simple and very efficient
                 electro-optic transducers, or light valves. Thin-film
                 transistors are simple electronic control devices which
                 can be fabricated on large transparent substrates.
                 These two technologies, when combined, allow the
                 fabrication of electronic displays which challenge the
                 dominance of the cathode ray tube (CRT). This paper
                 reviews the history of this important development,
                 presents the current status in comparison to the color
                 CRT, and describes the remaining challenges to be
                 overcome if the color CRT is truly to be displaced.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices); B2560R (Insulated gate field effect
                 transistors)",
  classification = "B2560R (Insulated gate field effect transistors);
                 B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "challenges; Challenges; colour displays; Colour
                 displays; history; History; introduction; Introduction;
                 LCD; liquid crystal displays; reviews; Reviews; TFT;
                 TFT/LCD; thin film transistors",
  thesaurus =    "History; Liquid crystal displays; Thin film
                 transistors",
  treatment =    "G General Review",
}

@Article{Alt:1992:GAT,
  author =       "P. M. Alt and C. G. Powell and B. L. {Owens, Jr.} and
                 H. Ifill",
  title =        "A gray-scale addressing technique for
                 thin-film-transistor\slash liquid crystal displays",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "11--22",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An addressing technique allowing continuous-tone color
                 images to be rendered on thin-film-transistor/liquid
                 crystal displays having bilevel drivers is described.
                 The technique uses multiple subfields per frame, with
                 driver voltages changed synchronously with the field
                 data. By using N bits of data per pixel, excitation is
                 applied to the display one bit-plane per field for N
                 consecutive fields. The technique is analyzed, its
                 benefits and limitations discussed, and experimental
                 results presented. Up to 16 gray levels have been
                 demonstrated with good image quality.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NJ, USA",
  classcodes =   "B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices); B2560R (Insulated gate field effect
                 transistors)",
  classification = "B2560R (Insulated gate field effect transistors);
                 B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bilevel drivers; Bilevel drivers; colour displays;
                 Colour displays; continuous-tone color images;
                 Continuous-tone color images; experimental results;
                 Experimental results; gray-scale addressing; Gray-scale
                 addressing technique; image; Image quality; LCD; liquid
                 crystal displays; multiple subfields per frame;
                 Multiple subfields per frame; quality; technique; TFT;
                 TFT/LCD; thin film transistors",
  thesaurus =    "Liquid crystal displays; Thin film transistors",
  treatment =    "P Practical; X Experimental",
}

@Article{Takano:1992:CDG,
  author =       "H. Takano and S. Suzuki and H. Hatoh",
  title =        "Cell design of gray-scale thin-film-transistor-driven
                 liquid crystal displays",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "23--42",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The desirable liquid crystal (LC) panel cell design
                 for a gray-scale thin-film-transistor (TFT) -driven
                 twisted nematic (TN) liquid crystal display (LCD) is
                 discussed in terms of display legibility and ease of
                 fabrication. To optimize cell design for gray-scale
                 application, some key display factors such as contrast
                 ratio, color change, and viewing cone are evaluated for
                 various cell geometries and cell thicknesses. The cell
                 geometries discussed are combinations of two display
                 modes (a normally white mode and a normally black mode)
                 and two optical eigenmodes. A new driving scheme of
                 threshold-voltage bias application to the LC cell is
                 proposed to overcome the TN LCD shortcoming of a narrow
                 viewing cone. The authors have adopted a cell design
                 for a 512-color TFT LCD: (1) a first minimum normally
                 white (NW) mode as polarizer arrangement for ease of
                 fabrication, (2) an extraordinary-ray mode (e-mode) as
                 optical eigenmode with a novel driving scheme
                 (threshold-voltage biased) for gray-scale improvement
                 in eliminating brightness reversals, and (3) a
                 retardation (d Delta n) value of 0.47$\mu$m for further
                 optimization of proper gray-scale order and color
                 change.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Japan, Display Technol., Kanagawa, Japan",
  classcodes =   "B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices)",
  classification = "B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems)",
  corpsource =   "IBM Japan, Display Technol., Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arrangement; cell; cell design; Cell design; Cell
                 geometries; cell thicknesses; Cell thicknesses; color
                 change; Color change; color displays; Color displays;
                 color LCD; Color LCD; contrast ratio; Contrast ratio;
                 display; Display factors; display legibility; Display
                 legibility; display modes; Display modes; driving;
                 Driving scheme; ease of fabrication; Ease of
                 fabrication; extraordinary-ray mode; Extraordinary-ray
                 mode; factors; geometries; gray-scale application;
                 Gray-scale application; LCD; liquid crystal display;
                 Liquid crystal display; liquid crystal displays; mode;
                 normally black mode; Normally black mode; normally
                 white; Normally white mode; optical eigenmodes; Optical
                 eigenmodes; polarizer; Polarizer arrangement; scheme;
                 TFT; TFT LCD; thin film transistors; threshold-voltage
                 bias; Threshold-voltage bias; twisted nematic; Twisted
                 nematic; viewing angle; Viewing angle; viewing cone;
                 Viewing cone",
  thesaurus =    "Liquid crystal displays; Thin film transistors",
  treatment =    "N New Development; P Practical; X Experimental",
}

@Article{Koseki:1992:CFT,
  author =       "T. Koseki and T. Fukunaga and H. Yamanaka and T.
                 Ueki",
  title =        "Color filter for 10.4-in.-diagonal 4096-color
                 thin-film-transistor liquid crystal displays",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "43--50",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Color filters with a wide color reproduction gamut and
                 high transmittance were developed for 10.4-in.-diagonal
                 4096-color thin-film-transistor liquid crystal displays
                 using pigment-dispersed photosensitive polymers. The
                 transmission spectrum of each color pixel was designed
                 in conjunction with other components such as backlight
                 and polarizers in order to meet front-of-screen quality
                 requirements. To improve screen quality, a
                 low-resistivity common electrode was used, eliminating
                 the top coating. A repair technique utilizing
                 back-exposure was also developed to improve production
                 yield. This pigment-dispersed-type color filter has the
                 merits of a simple process, low fabrication cost, good
                 uniformity, high reliability, and applicability to
                 high-resolution displays. There is a problem involving
                 deterioration of contrast ratio caused by the
                 depolarization effect of the color filter. The authors
                 measured depolarization factors for several pigments
                 and showed that the yellow pigment was the major
                 contributor. This depolarization effect has been
                 minimized.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Japan, Display Techol., Kanagawa, Japan",
  classcodes =   "B7260 (Display technology and systems); B4190F
                 (Optical coatings and filters); B4150D (Liquid crystal
                 devices)",
  classification = "B4150D (Liquid crystal devices); B4190F (Optical
                 coatings and filters); B7260 (Display technology and
                 systems)",
  corpsource =   "IBM Japan, Display Techol., Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "10.4 in; 10.4 In; backlight; Backlight; color filter;
                 color filters; Color filters; contrast; Contrast ratio;
                 depolarization effect; Depolarization effect;
                 front-of-screen quality; Front-of-screen quality; high
                 transmittance; High transmittance; high-resolution
                 displays; High-resolution displays; liquid crystal
                 displays; low fabrication cost; Low fabrication cost;
                 optical filters; pigment-dispersed photosensitive
                 polymers; Pigment-dispersed photosensitive polymers;
                 pigment-dispersed-type; Pigment-dispersed-type color
                 filter; polarizers; Polarizers; production yield;
                 Production yield; ratio; reliability; Reliability;
                 repair technique; Repair technique; simple process;
                 Simple process; spectrum; thin film; transistors;
                 transmission; Transmission spectrum; uniformity;
                 Uniformity; wide color reproduction; Wide color
                 reproduction",
  numericalindex = "Size 2.64E-01 m",
  thesaurus =    "Liquid crystal displays; Optical filters; Thin film
                 transistors",
  treatment =    "P Practical; X Experimental",
}

@Article{Lien:1992:LFE,
  author =       "A. Lien and R. A. John",
  title =        "Lateral field effect in twisted nematic cells",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "51--58",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The lateral field existing in the ON state of a liquid
                 crystal display (LCD) can result in an undesired
                 reverse tilt domain in each pixel, thereby leading to
                 poor contrast ratio of the display. As pixel size
                 becomes smaller to meet the requirements of a
                 high-information-content display, the problem becomes
                 worse. In this paper, the authors present experimental
                 results and theoretical analysis of the lateral field
                 effect in the twisted nematic (TN) cell, which is most
                 commonly used in the thin-film-transistor liquid
                 crystal displays (TFT/LCD). The effects of various cell
                 parameters, such as pretilt angle, bus-line-to-pixel
                 spacing, and cell gap thickness, on the pixel reverse
                 tilt domain and on the corresponding optical
                 performance have been studied in detail. The results
                 are useful for TFT/LCD design and cell fabrication.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices)",
  classification = "B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; angle; Bus-line-to-pixel spacing;
                 bus-line-to-pixel spacing; cell; Cell fabrication; cell
                 gap thickness; Cell gap thickness; Cell parameters;
                 cell parameters; contrast; Contrast ratio; Experimental
                 results; experimental results; fabrication; Lateral
                 field effect; lateral field effect; Liquid crystal
                 display; liquid crystal display; liquid crystal
                 displays; Optical performance; optical performance;
                 pixel; Pixel reverse tilt domain; pixel size; Pixel
                 size; pretilt; Pretilt angle; ratio; reverse tilt
                 domain; TFT/LCD; theoretical; Theoretical analysis;
                 thin film transistors; twisted nematic cells; Twisted
                 nematic cells",
  thesaurus =    "Liquid crystal displays; Thin film transistors",
  treatment =    "P Practical; X Experimental",
}

@Article{Jenkins:1992:FTT,
  author =       "L. C. Jenkins and R. J. Polastre and R. R. Troutman
                 and R. L. Wisnieff",
  title =        "Functional testing of {TFT\slash LCD} arrays",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "59--68",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The thin-film-transistor liquid crystal display
                 (TFT/LCD) is emerging as the leading flat-panel display
                 in computer applications. TFT array characterization is
                 important to the research, development, and
                 manufacturing of TFT/LCDs. The authors describe a new
                 Dynamic Array Tester developed for that purpose and
                 describes some examples of its use.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices); B0170E (Production facilities and
                 engineering); B0170L (Inspection and quality control);
                 B7210B (Automatic test and measurement systems); B2560R
                 (Insulated gate field effect transistors); C7410H
                 (Instrumentation)",
  classification = "B0170E (Production facilities and engineering);
                 B0170L (Inspection and quality control); B2560R
                 (Insulated gate field effect transistors); B4150D
                 (Liquid crystal devices); B7210B (Automatic test and
                 measurement systems); B7260 (Display technology and
                 systems); C7410H (Instrumentation)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic test equipment; color displays; Color
                 displays; display; displays; Dynamic Array Tester;
                 electron device testing; flat-panel; Flat-panel
                 display; functional testing; Functional testing; IBM;
                 inspection; integrated circuit testing; liquid crystal;
                 TFT array characterization; TFT/LCD; thin film
                 transistors; thin-film-; Thin-film-transistor liquid
                 crystal display; transistor liquid crystal display",
  thesaurus =    "Automatic test equipment; Electron device testing;
                 Inspection; Integrated circuit testing; Liquid crystal
                 displays; Thin film transistors",
  treatment =    "P Practical; R Product Review; X Experimental",
}

@Article{Kuo:1992:RIE,
  author =       "Y. Kuo",
  title =        "Reactive ion etching technology in
                 thin-film-transistor processing",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "69--75",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Discusses reactive ion etching (RIE) process issues in
                 preparing thin-film transistors (TFTs) for liquid
                 crystal displays (LCDs). Three areas were examined in
                 detail: gate metal etch, dielectric etch, and a-Si:H
                 etch, both intrinsic and n/sup +/ doped. Although there
                 are different requirements for each step, the basic
                 principles for the etching process are similar. For
                 example, each process includes three major mechanisms:
                 plasma-phase chemistry, particle transport phenomena,
                 and surface reactions. All data on the etching results
                 were interpreted according to these principles.
                 Finally, a TFT characteristic curve based on RIE of
                 some of the most critical process steps is presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si:H/bin Si/bin H/bin Si/el H/el H/dop",
  classcodes =   "B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems); B2560R (Insulated gate field
                 effect transistors); B2550E (Surface treatment)",
  classification = "B2550E (Surface treatment); B2560R (Insulated gate
                 field effect transistors); B4150D (Liquid crystal
                 devices); B7260 (Display technology and systems)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "a-Si:H etch; A-Si:H etch; amorphous Si:H; Amorphous
                 Si:H etch; characteristic curve; critical process
                 steps; Critical process steps; dielectric; Dielectric
                 etch; etch; etching process; Etching process; gate
                 metal etch; Gate metal etch; LCDs; liquid crystal
                 displays; Liquid crystal displays; particle transport
                 phenomena; Particle transport phenomena; plasma-phase
                 chemistry; Plasma-phase chemistry; reactive ion
                 etching; Reactive ion etching; sputter etching; surface
                 reactions; Surface reactions; TFT; TFT characteristic
                 curve; TFTs; thin film; thin-film-transistor
                 processing; Thin-film-transistor processing;
                 transistors",
  thesaurus =    "Liquid crystal displays; Sputter etching; Thin film
                 transistors",
  treatment =    "X Experimental",
}

@Article{Fujimoto:1992:SVS,
  author =       "Y. Fujimoto",
  title =        "Study of the {V}$_{\rm th}$ shift of the thin-film
                 transistor by the bias temperature stress test",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "76--82",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Amorphous silicon thin-film transistors (a-Si:H TFTs)
                 are now widely used as the switching device in the
                 active-matrix addressing of liquid crystal displays.
                 One concern is the potential instability problems
                 associated with the threshold voltage (V$_{th}$) shifts
                 to higher values after prolonged operating times. The
                 reason for this V$_{th}$ shift has been widely
                 discussed, and two models accounting for it have been
                 suggested. One model explains the shifts by the
                 trapping of electrons in the insulator, the other model
                 by the creation of the metastable states at the
                 a-Si:H/SiN$_x$ interface. The author's TFT insulator
                 has the rather complicated structure of an anodic oxide
                 film, SiO$_x$, SiN$_x$ sequentially stacked over the
                 gate electrode, which makes it difficult to separate
                 the contribution of each layer. To confirm the V$_{th}$
                 shift mechanism and the contribution of each layer of
                 insulator to the V$_{th}$ shift, he prepared samples
                 with a series of different insulators and measured the
                 bias dependence of their V$_{th}$ shifts. His results
                 show that the anodic oxide film makes no contribution
                 to the V$_{th}$ shift, and it makes little difference
                 to the V$_{th}$ shift whether the next insulator is
                 SiN$_x$ or SiO$_x$.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Japan, Display Technol., Kanagawa, Japan",
  chemicalindex = "SiN/int SiO/int Si/int N/int O/int SiN/bin SiO/bin
                 Si/bin N/bin O/bin; Si:H/int Si/int H/int Si:H/bin
                 Si/bin H/bin Si/el H/el H/dop; Si:H-SiN/int Si:H/int
                 SiN/int Si/int H/int N/int Si:H/bin SiN/bin Si/bin
                 H/bin N/bin Si/el H/el H/dop",
  classcodes =   "B2560R (Insulated gate field effect transistors);
                 B7260 (Display technology and systems); B4150D (Liquid
                 crystal devices); B2560B (Modelling and equivalent
                 circuits); B0170E (Production facilities and
                 engineering); B2520F (Amorphous and glassy
                 semiconductors); B0550 (Composite materials); B2830E
                 (Inorganic insulation)",
  classification = "B0170E (Production facilities and engineering);
                 B0550 (Composite materials); B2520F (Amorphous and
                 glassy semiconductors); B2560B (Modelling and
                 equivalent circuits); B2560R (Insulated gate field
                 effect transistors); B2830E (Inorganic insulation);
                 B4150D (Liquid crystal devices); B7260 (Display
                 technology and systems)",
  corpsource =   "IBM Japan, Display Technol., Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "active-matrix; Active-matrix addressing; addressing;
                 amorphous semiconductors; Amorphous Si:H transistors;
                 amorphous Si:H transistors; Anodic oxide film; anodic
                 oxide film; Bias temperature stress test; bias
                 temperature stress test; composite insulating
                 materials; dielectric thin films; electrons; elemental
                 semiconductors; environmental testing; hydrogen; Liquid
                 crystal displays; liquid crystal displays; Metastable
                 states; metastable states; Models; models;
                 semiconductor device models; Semiconductors;
                 semiconductors; Si:H-SiN$_x$; silicon; silicon
                 compounds; TFT; thin film transistors; thin-film;
                 Thin-film transistor; Threshold voltage shift;
                 threshold voltage shift; transistor; trapping of;
                 Trapping of electrons",
  thesaurus =    "Amorphous semiconductors; Composite insulating
                 materials; Dielectric thin films; Elemental
                 semiconductors; Environmental testing; Hydrogen; Liquid
                 crystal displays; Semiconductor device models; Silicon;
                 Silicon compounds; Thin film transistors",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Wong:1992:TCD,
  author =       "H.-S. Wong and Y. L. Yao and E. S. Schlig",
  title =        "{TDI} charge-coupled devices; design and
                 applications",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "1",
  pages =        "83--106",
  month =        jan,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The design and applications of charge-coupled devices
                 (CCDs) operated in the time-delay-and-integration (TDI)
                 mode are reviewed. Design issues regarding the use of
                 the TDI-CCD imager for visible imaging applications are
                 discussed. Aspects pertaining to its parallel array,
                 serial-to-parallel interface, serial register,
                 modulation transfer function (MTF), discrete charge
                 motion, motion synchronization, clocking, number of
                 integrating stages, noise, dynamic range, sensitivity,
                 output uniformity, device yield, pixel size, and
                 spectral response are highlighted in the context of
                 their effect on system performance. Its imaging
                 characteristics are compared to those of the photodiode
                 linear array imager, and design studies and
                 experimental results for a family of TDI-CCD imagers
                 for scanning documents and museum art objects are
                 described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "A0762 (Detection of radiation (bolometers,
                 photoelectric cells, i.r. and submillimetre waves
                 detection)); A4230L (Modulation and optical transfer
                 functions); B7230G (Image sensors); B2570H (Other field
                 effect integrated circuits)",
  classification = "A0762 (Detection of radiation (bolometers,
                 photoelectric cells, i.r. and submillimetre waves
                 detection)); A4230L (Modulation and optical transfer
                 functions); B2570H (Other field effect integrated
                 circuits); B7230G (Image sensors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; Applications; CCD image sensors;
                 charge-coupled devices; Charge-coupled devices;
                 clocking; Clocking; design issues; Design issues;
                 design studies; Design studies; device; Device yield;
                 discrete charge motion; Discrete charge motion; dynamic
                 range; Dynamic range; experimental results;
                 Experimental results; function; imaging
                 characteristics; Imaging characteristics; modulation
                 transfer; Modulation transfer function; motion; Motion
                 synchronization; MTF; museum art objects; noise; Noise;
                 number of integrating stages; Number of integrating
                 stages; optical transfer function; output uniformity;
                 Output uniformity; parallel array; Parallel array;
                 parallel interface; photodiode linear array imager;
                 Photodiode linear array imager; pixel size; Pixel size;
                 scanning; scanning documents; Scanning documents;
                 Scanning museum art objects; sensitivity; Sensitivity;
                 serial register; Serial register; serial-to-;
                 Serial-to-parallel interface; spectral response;
                 Spectral response; synchronization; system performance;
                 System performance; TDI-CCD imager;
                 time-delay-and-integration mode;
                 Time-delay-and-integration mode; visible imaging;
                 Visible imaging; yield",
  thesaurus =    "CCD image sensors; Optical transfer function",
  treatment =    "B Bibliography; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Lipari:1992:PMS,
  author =       "N. O. Lipari",
  title =        "Preface: Materials Science for Silicon Technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "138--139",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
}

@Article{Oehrlein:1992:PDE,
  author =       "G. S. Oehrlein and J. F. Rembetski",
  title =        "Plasma-based dry etching techniques in the silicon
                 integrated circuit technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "140--157",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Plasma-based dry etching techniques play a major role
                 in the formation of silicon-based integrated circuits.
                 The first part of this paper reviews understanding of
                 the means for achieving etching directionality and
                 selectivity in reactive etching using glow discharges.
                 Relevant trends in magnetically enhanced RF diode
                 systems, microwave-excited electron cyclotron resonance
                 plasmas, process clustering, real-time process
                 monitoring and control, and computer modeling of glow
                 discharges are discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B2550E (Surface treatment); B2570 (Semiconductor
                 integrated circuits)",
  classification = "B2550E (Surface treatment); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit technology; clustering; computer modeling;
                 Computer modeling; dry; Dry etching techniques;
                 elemental semiconductors; etching; etching
                 directionality; Etching directionality; etching
                 selectivity; Etching selectivity; etching techniques;
                 excited electron cyclotron resonance plasmas; glow
                 discharges; Glow discharges; integrated; integrated
                 circuit technology; Integrated circuit technology;
                 microwave-; Microwave-excited electron cyclotron
                 resonance plasmas; process; Process clustering;
                 reactive; Reactive etching; real-time process
                 monitoring; Real-time process monitoring; RF diode
                 systems; semiconductor process modelling; Si; silicon;
                 sputter etching",
  thesaurus =    "Elemental semiconductors; Glow discharges; Integrated
                 circuit technology; Semiconductor process modelling;
                 Silicon; Sputter etching",
  treatment =    "A Application; P Practical",
}

@Article{Fahey:1992:SDS,
  author =       "P. M. Fahey and S. R. Mader and S. R. Stiffler and R.
                 L. Mohler and J. D. Mis and J. A. Slinkman",
  title =        "Stress-induced dislocations in silicon integrated
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "158--182",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Many of the processes used in the fabrication of
                 silicon integrated circuits lead to the development of
                 stress in the silicon substrate. Given enough stress,
                 the substrate will yield by generating dislocations.
                 The authors examine the formation of stress-induced
                 dislocations in integrated circuit structures. Examples
                 are presented from bipolar and MOS-based integrated
                 circuit structures that were created during
                 developmental studies. The underlying causes of
                 oxidation-induced stress and the effect on such stress
                 of varying oxidation conditions are discussed. The
                 knowledge thus gained is used to explain dislocation
                 generation during the formation of a shallow-trench
                 isolation structure. The importance of ion-implantation
                 processes in nucleating dislocations is illustrated
                 using structures formed by a deep-trench isolation
                 process and a process used to form a trench capacitor
                 in a DRAM cell.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B2550E (Surface treatment); B2570F (Other MOS
                 integrated circuits); B2570B (Bipolar integrated
                 circuits); B1265D (Memory circuits)",
  classification = "B1265D (Memory circuits); B2550E (Surface
                 treatment); B2570B (Bipolar integrated circuits);
                 B2570F (Other MOS integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar IC; Bipolar IC; bipolar integrated circuits;
                 capacitor; circuits; dislocation generation;
                 Dislocation generation; dislocations; DRAM cell; DRAM
                 chips; elemental semiconductors; Elemental
                 semiconductors; induced stress; integrated circuit
                 structures; Integrated circuit structures; integrated
                 circuit technology; internal stresses; ion
                 implantation; ion-implantation processes;
                 Ion-implantation processes; isolation structure; MOS
                 IC; MOS integrated; oxidation; oxidation-;
                 Oxidation-induced stress; shallow-trench;
                 Shallow-trench isolation structure; Si; silicon;
                 stress-induced; Stress-induced dislocations; trench;
                 Trench capacitor",
  thesaurus =    "Bipolar integrated circuits; Dislocations; DRAM chips;
                 Elemental semiconductors; Integrated circuit
                 technology; Internal stresses; Ion implantation; MOS
                 integrated circuits; Oxidation; Silicon",
  treatment =    "P Practical; X Experimental",
}

@Article{Kuan:1992:AEI,
  author =       "T. S. Kuan and P. E. Batson and R. M. Feenstra and A.
                 J. Slavin and R. M. Tromp",
  title =        "Application of electron and ion beam analysis
                 techniques to microelectronics",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "183--207",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The application of electron microscopy, scanning
                 tunneling microscopy, and medium-energy ion scattering
                 to microelectronics is reviewed. These analysis
                 techniques are playing an important role in advancing
                 the technology. Their use in the study of relevant
                 phenomena regarding surfaces, interfaces, and defects
                 is discussed. Recent developments and applications are
                 illustrated using results obtained at the IBM Thomas J.
                 Watson Research Center. Potential advances in the
                 techniques are also discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2570 (Semiconductor integrated circuits); B2390
                 (Electron and ion microscopes)",
  classification = "B2390 (Electron and ion microscopes); B2570
                 (Semiconductor integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; defects; Defects; electron microscopy;
                 Electron microscopy; integrated circuit testing;
                 interfaces; Interfaces; ion beam; ion beam analysis;
                 Ion beam analysis; medium-energy ion scattering;
                 Medium-energy ion scattering; microelectronics;
                 Microelectronics; monolithic integrated circuits;
                 scanning; scanning tunneling microscopy; Scanning
                 tunneling microscopy; surfaces; Surfaces; tunnelling
                 microscopy",
  thesaurus =    "Electron microscopy; Integrated circuit testing; Ion
                 beam applications; Monolithic integrated circuits;
                 Scanning tunnelling microscopy",
  treatment =    "A Application; P Practical",
}

@Article{Lee:1992:NMA,
  author =       "W. Lee and S. E. Laux and M. V. Fischetti and G.
                 Baccarani and A. Gnudi and J. M. C. Stork and J. A.
                 Mandelman and E. F. Crabbe and M. R. Wordeman and F.
                 Odeh",
  title =        "Numerical modeling of advanced semiconductor devices",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "208--232",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Numerical modeling of the electrical behavior of
                 semiconductor devices is playing an increasingly
                 important role in their development. Examples that
                 pertain to advanced MOSFETs and bipolar transistors are
                 presented to illustrate the importance of taking into
                 account three-dimensional as well as nonequilibrium and
                 nonlocal physical phenomena to effectively characterize
                 the electrical behavior of such devices.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2560B (Modelling and equivalent circuits); B2560R
                 (Insulated gate field effect transistors); B2560J
                 (Bipolar transistors)",
  classification = "B2560B (Modelling and equivalent circuits); B2560J
                 (Bipolar transistors); B2560R (Insulated gate field
                 effect transistors)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D phenomena; bipolar; bipolar transistors; Bipolar
                 transistors; electrical behavior; Electrical behavior;
                 insulated gate field effect; MOSFETs; nonequilibrium
                 phenomena; Nonequilibrium phenomena; nonlocal physical
                 phenomena; Nonlocal physical phenomena; numerical
                 modelling; Numerical modelling; semiconductor device
                 models; semiconductor devices; Semiconductor devices;
                 transistors",
  thesaurus =    "Bipolar transistors; Insulated gate field effect
                 transistors; Semiconductor device models",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Rubloff:1992:IPM,
  author =       "G. W. Rubloff and D. T. Bordonaro",
  title =        "Integrated processing for microelectronics science and
                 technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "233--276",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Reviews of integrated processing-an approach to
                 microelectronics fabrication in which sequential
                 processes are linked by wafer transfer through a clean,
                 controlled environment (e.g. high vacuum or inert gas).
                 The approach is rapidly becoming the state of the art
                 in microelectronics research, development, and
                 manufacturing. In microelectronics research, it
                 provides a means for advancing mechanistic
                 understanding and material quality through in situ
                 fabrication of test structures and extensive in situ
                 diagnostics. In microelectronics development and
                 manufacturing, it promises process simplification,
                 improved contamination control and yield, and
                 potentially more flexible equipment utilization. With
                 increasing emphasis on ultraclean processing, involving
                 control of reactive impurities as well as particles,
                 and on real-time process monitoring and control,
                 applications of integrated processing are moving toward
                 a common ground in which state-of-the-art research
                 techniques can be used to address key issues in
                 development and manufacturing, and provide in return
                 substantive guidelines for manufacturing design and
                 practice.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2550 (Semiconductor device technology); B0170E
                 (Production facilities and engineering); B0170E
                 (Production facilities and engineering)",
  classification = "B0170E (Production facilities and engineering);
                 B2550 (Semiconductor device technology)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "clean rooms; contamination control; Contamination
                 control; controlled; Controlled environment;
                 environment; in; In situ diagnostics; integrated
                 processing; Integrated processing; microelectronics
                 development; Microelectronics development;
                 microelectronics fabrication; Microelectronics
                 fabrication; microelectronics research;
                 Microelectronics research; production testing; quality
                 control; reactive impurities; Reactive impurities;
                 real-time process monitoring; Real-time process
                 monitoring; semiconductor device testing; semiconductor
                 technology; sequential processes; Sequential processes;
                 situ diagnostics; test structures; Test structures;
                 ultraclean processing; Ultraclean processing; wafer
                 transfer; Wafer transfer; yield; Yield",
  thesaurus =    "Clean rooms; Production testing; Quality control;
                 Semiconductor device testing; Semiconductor
                 technology",
  treatment =    "G General Review; P Practical",
}

@Article{Anonymous:1992:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "277--319",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:12:47 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1992:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "2",
  pages =        "321--325",
  month =        mar,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:12:47 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Griesmer:1992:PPA,
  author =       "J. H. Griesmer",
  title =        "Preface: Papers on Artificial Intelligence",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "328--328",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wiederhold:1992:ASP,
  author =       "Gio Wiederhold and John McCarthy",
  title =        "{Arthur Samuel}: Pioneer in Machine Learning",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "329--331",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:07:49 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Antonacci:1992:CDM,
  author =       "F. Antonacci and C. M. Calamani",
  title =        "Capturing the deep meaning of texts through deduction
                 and inference",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "333--345",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "One of the main problems in the computer analysis of
                 natural language is understanding sentences beyond a
                 surface level, i.e. making inferences about likely
                 circumstances and drawing plausible conclusions. At the
                 first level, a natural-language-understanding system
                 can answer simple and trivial questions; in order to
                 extend the domain of possible questions that it can
                 answer, the system must make presuppositions and
                 recognize implications that depend on certain events
                 (also called actions). The IBM Rome Scientific Center
                 has developed a prototype system that is able to make
                 inferences about what might be true. This system has
                 been integrated with a text-understanding system
                 (System N), also developed at Rome.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rome, Italy",
  classcodes =   "C6180N (Natural language processing); C6170 (Expert
                 systems)",
  classification = "C6170 (Expert systems); C6180N (Natural language
                 processing)",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "actions; Actions; computer analysis; Computer
                 analysis; deduction; Deduction; implications
                 recognition; Implications recognition; inference
                 mechanisms; inferences; Inferences; likely
                 circumstances; Likely circumstances; natural languages;
                 natural-language-understanding;
                 Natural-language-understanding system; plausible
                 conclusions; Plausible conclusions; presuppositions;
                 Presuppositions; sentence understanding; Sentence
                 understanding; system; System N; text-understanding
                 system; Text-understanding system",
  thesaurus =    "Inference mechanisms; Natural languages",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Casanova:1992:ESR,
  author =       "M. A. Casanova and A. S. Hemerly and R. A. de T.
                 Guerreiro",
  title =        "Explaining {SLDNF} resolution with non-normal
                 defaults",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "347--359",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68N17 (68Q55)",
  MRnumber =     "93i:68037",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper defines a default logic interpretation for
                 normal programs that has the following major
                 characteristics. First, it directly captures the true
                 nature of SLDNF resolution as an extension of SLD
                 resolution. Second, it is semantically convincing, but
                 it requires neither an elaborated nonstandard
                 interpretation nor a radical rewriting of the program
                 clauses that would make it difficult to understand
                 their meaning. Last, it extends known results for
                 stratified normal programs to programs that satisfy a
                 weaker condition.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rio de Janeiro, Brazil",
  classcodes =   "C4240 (Programming and algorithm theory); C6110L
                 (Logic programming); C4210 (Formal logic); C1230
                 (Artificial intelligence)",
  classification = "C1230 (Artificial intelligence); C4210 (Formal
                 logic); C4240 (Programming and algorithm theory);
                 C6110L (Logic programming)",
  corpsource =   "IBM, Rio de Janeiro, Brazil",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "default logic interpretation; Default logic
                 interpretation; explanation; formal logic; logic
                 programming; normal programs; Normal programs; program
                 clauses; Program clauses; programming; resolution; SLD
                 resolution; SLDNF; SLDNF resolution; theory",
  thesaurus =    "Explanation; Formal logic; Logic programming;
                 Programming theory",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Guerreiro:1992:SPL,
  author =       "R. A. de T. Guerreiro and A. S. Hemerly and M. A.
                 Casanova",
  title =        "{STORK} and {PENGUIN}: logic programming systems using
                 general clauses and defaults",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "361--374",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68N17",
  MRnumber =     "1 193 365",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes two logic programming systems with
                 the expressive power of full clausal first-order logic
                 and with a nonmonotonic component. They provide a
                 direct generalization of pure Prolog and can be
                 implemented using the same technology as Prolog
                 processors. The inference engine of both systems is
                 based on the weak-model elimination method which, in
                 the case of the second system, is extended to
                 incorporate defaults.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rio de Janeiro, Brazil",
  classcodes =   "C4240 (Programming and algorithm theory); C1230
                 (Artificial intelligence); C6110L (Logic programming);
                 C6140D (High level languages)",
  classification = "C1230 (Artificial intelligence); C4240 (Programming
                 and algorithm theory); C6110L (Logic programming);
                 C6140D (High level languages)",
  corpsource =   "IBM, Rio de Janeiro, Brazil",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "clausal first-; Clausal first-order logic; inference
                 engine; Inference engine; logic programming; logic
                 programming systems; Logic programming systems;
                 nonmonotonic component; Nonmonotonic component;
                 nonmonotonic reasoning; order logic; PENGUIN;
                 processors; programming; Prolog; PROLOG; Prolog
                 processors; pure Prolog; Pure Prolog; STORK; theory;
                 weak-model elimination method; Weak-model elimination
                 method",
  thesaurus =    "Logic programming; Nonmonotonic reasoning; Programming
                 theory; PROLOG",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Beierle:1992:LPT,
  author =       "C. Beierle",
  title =        "Logic programming with typed unification and its
                 realization on an abstract machine",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "375--390",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  MRclass =      "68N17 (68Q55)",
  MRnumber =     "1 193 366",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Logic programming can benefit from a typing concept
                 which supports many software engineering principles
                 such as data abstraction, modularization, etc. From a
                 computational point of view, the use of types can
                 drastically reduce the search space. Starting from
                 these observations, the paper gives a survey of
                 many-sorted, order-sorted, and polymorphic approaches
                 to type concepts in logic programming. The underlying
                 unification procedures for ordinary term unification,
                 order-sorted unification, and in particular for
                 polymorphic order-sorted unification are given in the
                 style of solving a set of equations, giving a common
                 basis for comparing them. In addition, the realization
                 of these unification procedures on a Warren abstract
                 machine-like architecture is described. Special
                 emphasis is placed on the abstract machine developed
                 for PROTOS-L, a logic programming language based on
                 polymorphic order-sorted unification.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Heidelberg, Germany",
  classcodes =   "C4240 (Programming and algorithm theory); C6110L
                 (Logic programming); C6140D (High level languages);
                 C1230 (Artificial intelligence)",
  classification = "C1230 (Artificial intelligence); C4240 (Programming
                 and algorithm theory); C6110L (Logic programming);
                 C6140D (High level languages)",
  corpsource =   "IBM, Heidelberg, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "data abstraction; Data abstraction; engineering;
                 logic; logic programming; Logic programming; logic
                 programming language; Logic programming language; logic
                 programming languages; modularization; Modularization;
                 order-sorted; Order-sorted unification; ordinary term
                 unification; Ordinary term unification; polymorphic
                 order-sorted unification; Polymorphic order-sorted
                 unification; programming; PROTOS-L; software; Software
                 engineering; type theory; typed unification; Typed
                 unification; unification; Warren abstract machine",
  thesaurus =    "Logic programming; Logic programming languages; Type
                 theory",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Asakawa:1992:ZTT,
  author =       "Y. Asakawa and H. Komatsu and H. Etoh and Y. Hama and
                 K. Maruyama",
  title =        "{Zephyr}: Toward true compiler-based programming in
                 {Prolog}",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "391--408",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Prolog is widely used in prototyping, especially in
                 artificial intelligence, but it has yet to gain
                 widespread acceptance in application development. The
                 authors think that the problems in this area result
                 from the programming style enforced in existing Prolog
                 systems. Zephyr is a new Prolog system refined and
                 enhanced to help solve such problems. It allows users
                 to do modular programming by always using a compiler
                 instead of an interpreter. The authors describe the
                 unique features of Zephyr which make this possible,
                 focusing especially on package, metafunctions, and
                 tables, and the implementation of the system on OS/2.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Kanagawa, Japan",
  classcodes =   "C6140D (High level languages); C6110L (Logic
                 programming); C6150C (Compilers, interpreters and other
                 processors)",
  classification = "C6110L (Logic programming); C6140D (High level
                 languages); C6150C (Compilers, interpreters and other
                 processors)",
  corpsource =   "IBM, Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "artificial; Artificial intelligence; compiler-based
                 programming; Compiler-based programming; compilers;
                 intelligence; logic programming; logic programming
                 languages; metafunctions; Metafunctions; modular
                 programming; Modular programming; OS/2; package;
                 Package; program; programming style; Programming style;
                 PROLOG; Prolog system; prototyping; Prototyping;
                 tables; Tables; Zephyr",
  thesaurus =    "Logic programming; Logic programming languages;
                 Program compilers; PROLOG",
  treatment =    "P Practical",
}

@Article{Apte:1992:ECO,
  author =       "C. V. Apte and R. A. Dionne and J. H. Griesmer and M.
                 Karnaugh and J. K. Kastner and M. M. Laker and E. K.
                 Mays",
  title =        "An experiment in constructing an open expert system
                 using a knowledge substrate",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "409--434",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Discusses an experiment in the use of an
                 object-centered knowledge representation service to
                 provide a common conceptual model for the construction
                 of a large knowledge-intensive decision support tool. A
                 core knowledge substrate forms a common resource for a
                 variety of problem-solving activities and a basis for
                 the rapid construction of new capabilities. FAME, a
                 substantial expert system to aid in the financial
                 marketing of IBM mainframes, has been built and
                 extensively tested in the field to validate these tools
                 and techniques.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Yorktown Heights, NY, USA",
  classcodes =   "C7120 (Finance); C7170 (Marketing); C6170 (Expert
                 systems); C7102 (Decision support systems)",
  classification = "C6170 (Expert systems); C7102 (Decision support
                 systems); C7120 (Finance); C7170 (Marketing)",
  corpsource =   "IBM, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "common conceptual model; Common conceptual model;
                 common resource; Common resource; decision support
                 systems; expert systems; FAME; financial data;
                 financial marketing; Financial marketing; IBM
                 mainframes; knowledge representation; knowledge
                 representation service; knowledge substrate; Knowledge
                 substrate; knowledge-intensive decision support tool;
                 Knowledge-intensive decision support tool; marketing
                 data; object-centered; Object-centered knowledge
                 representation service; open expert system; Open expert
                 system; problem solving; problem-solving;
                 Problem-solving; processing",
  thesaurus =    "Decision support systems; Expert systems; Financial
                 data processing; Knowledge representation; Marketing
                 data processing; Problem solving",
  treatment =    "P Practical; X Experimental",
}

@Article{Wetter:1992:UNL,
  author =       "T. Wetter and R. Nuse",
  title =        "Use of natural language for knowledge acquisition:
                 Strategies to cope with semantic and pragmatic
                 variation",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "435--468",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The large amount of verbal data from common
                 knowledge-elicitation methods suggests using the data
                 directly for knowledge acquisition by means of
                 sophisticated natural-language analyzers (NLAs). The
                 paper analyzes the feasibility of such an approach
                 theoretically and presents a number of examples. In the
                 theoretical part of the text it first provides a
                 detailed analysis of the entities involved, i.e. the
                 domains of expertise, the qualities of knowledge about
                 domains, the properties of generic sentences and texts
                 in natural languages, and the conclusions to be drawn
                 from the limited expressiveness of formal
                 representations. Then it discusses the processes of
                 transforming knowledge into natural language and of
                 transforming natural language into formal language.
                 Since much can go wrong in both processes, the paper
                 derives desired relations or validity criteria among
                 the entities and strategies to meet the criteria. It is
                 believed that this broad theoretical framework can be
                 used to analyze and compare existing attempts at
                 directly using natural language for knowledge
                 acquisition, and thus assess the present status of the
                 field.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Heidelberg, Germany",
  classcodes =   "C6170 (Expert systems); C6180N (Natural language
                 processing)",
  classification = "C6170 (Expert systems); C6180N (Natural language
                 processing)",
  corpsource =   "IBM, Heidelberg, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "entities; Entities; formal; Formal language; knowledge
                 acquisition; Knowledge acquisition;
                 knowledge-elicitation; Knowledge-elicitation methods;
                 language; methods; natural languages; natural-language
                 analyzers; Natural-language analyzers; strategies;
                 Strategies; validity criteria; Validity criteria;
                 verbal data; Verbal data",
  thesaurus =    "Knowledge acquisition; Natural languages",
  treatment =    "B Bibliography; P Practical",
}

@Article{Nguyen:1992:TRA,
  author =       "T. N. Nguyen and H. E. Stephanou",
  title =        "Topological reasoning about dextrous grasps",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "469--486",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper introduces a reasoning scheme called
                 topological reasoning that is used in conjunction with
                 a grasp-based, topological model for uniform
                 representations of multifingered robot hands at
                 different levels of detail (e.g. whole hand, finger,
                 joint), and discusses its application to dextrous
                 manipulation (grasp selection and regrasping). It is
                 shown that using topological reasoning, both hand
                 posture and hand functionality can be derived from
                 symbolic, high-level task requirements and object
                 attributes, and can be transformed into numeric,
                 low-level, joint space variables. Furthermore, the
                 reasoning scheme is applicable not only to tip
                 prehension, but also to palm prehension and any
                 combination of the two.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Gaithersburg, MD, USA",
  classcodes =   "C3390 (Robotics); C6170 (Expert systems); C1230
                 (Artificial intelligence)",
  classification = "C1230 (Artificial intelligence); C3390 (Robotics);
                 C6170 (Expert systems)",
  corpsource =   "IBM, Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Dextrous grasps; dextrous grasps; Dextrous
                 manipulation; dextrous manipulation; grasp; Grasp
                 selection; Hand functionality; hand functionality; hand
                 posture; Hand posture; inference mechanisms;
                 manipulators; Multifingered robot hands; multifingered
                 robot hands; Palm prehension; palm prehension;
                 prehension; Regrasping; regrasping; selection; tip; Tip
                 prehension; Topological model; topological model;
                 topological reasoning; Topological reasoning",
  thesaurus =    "Inference mechanisms; Manipulators",
  treatment =    "B Bibliography; P Practical",
}

@Article{DiZenzo:1992:ORH,
  author =       "S. {Di Zenzo}o and M. {Del Buono} and M. Meucci and A.
                 Spirito",
  title =        "Optical recognition of hand-printed characters of any
                 size, position, and orientation",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "487--501",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Deals with the optical recognition of text data in
                 documents such as engineering drawings, land-use and
                 land-register maps, and utility maps. The automatic
                 computer acquisition of these documents is performed
                 through the basic steps of vectorization of the
                 line-structure and recognition of the text data
                 interspersed in the document. The latter data are
                 usually handwritten by professional draftsmen, and may
                 have any size, position, and orientation. The paper
                 reviews some of the features appropriate to this
                 particular OCR problem, and suggests a special
                 recognition strategy. Numerous examples are given. The
                 results obtained with a prototype system on actual
                 land-register maps are reported.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM, Rome, Italy",
  classcodes =   "C5260B (Computer vision and picture processing)",
  classification = "C5260B (Computer vision and picture processing)",
  corpsource =   "IBM, Rome, Italy",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automatic computer acquisition; Automatic computer
                 acquisition; engineering drawings; Engineering
                 drawings; hand-printed characters; Hand-printed
                 characters; handwritten data; Handwritten data; land
                 use maps; Land use maps; land-; Land-register maps;
                 line structure vectorization; Line structure
                 vectorization; OCR; optical character recognition;
                 optical recognition; Optical recognition; professional
                 draftsmen; Professional draftsmen; recognition;
                 register maps; text data; Text data; Text data
                 recognition; utility maps; Utility maps",
  thesaurus =    "Optical character recognition",
  treatment =    "P Practical",
}

@Article{Anonymous:1992:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "503--525",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:15:21 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1992:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "3",
  pages =        "527--529",
  month =        may,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Donofrio:1992:P,
  author =       "N. M. Donofrio",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "533--534",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:13:21 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: ``System\slash 390 architecture''.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Calta:1992:ESC,
  author =       "S. A. Calta and S. A. deVeer and E. Loizides and R. N.
                 Strangewayes",
  title =        "{Enterprise Systems Connection} ({ESCON}) Architecture
                 --- System overview",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "535--551",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper introduces an IBM data processing
                 interconnection system called Enterprise Systems
                 Connection (ESCON) Architecture. Utilizing
                 state-of-the-art fiber optic technology, the ESCON
                 system introduces a unique concept to computer
                 interconnection topology, the dynamic switched
                 point-to-point connection. A comprehensive solution to
                 the interconnection of data processing equipment and
                 systems, the ESCON system offers superior connectivity,
                 bandwidth, distance, and ease of installation. The
                 ESCON architecture is directed toward the structuring
                 of large dispersed multisystem data processing centers
                 with campus distributed user communities, but it is
                 equally well suited to the needs of small processing
                 configurations. The paper first reviews the objectives
                 of the ESCON development and then gives a more detailed
                 discussion of the system design alternatives and
                 choices which were made. Topics discussed are the fiber
                 optic technology, the interconnection topology, the
                 ESCON architecture, and the design of the major system
                 elements.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); C5620L (Local area networks)",
  classification = "B6210L (Computer communications); B6260 (Optical
                 links and equipment); C5620L (Local area networks)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "alternatives; campus distributed user communities;
                 Campus distributed user communities; centers; computer;
                 Computer interconnection topology; connection; dynamic
                 switched point-to-point; Dynamic switched
                 point-to-point connection; Enterprise; Enterprise
                 Systems Connection; ESCON; fiber optic technology;
                 Fiber optic technology; IBM computers; IBM data
                 processing interconnection system; interconnection
                 networks; interconnection topology; large dispersed
                 multisystem data processing; Large dispersed
                 multisystem data processing centers; local area
                 networks; multiprocessor; optical links; system design;
                 System design alternatives; Systems Connection",
  thesaurus =    "IBM computers; Local area networks; Multiprocessor
                 interconnection networks; Optical links",
  treatment =    "P Practical; R Product Review",
  xxauthor =     "S. A. Calta and J. A. {de Veer} and E. Loizides and R.
                 N. Strangwayes",
}

@Article{Aulet:1992:IES,
  author =       "N. R. Aulet and D. W. Boerstler and G. DeMario and F.
                 D. Ferraiolo and C. E. Hayward and C. D. Heath and A.
                 L. Huffman and W. R. Kelly and G. W. Peterson and D. J.
                 {Stigliani, Jr.}",
  title =        "{IBM Enterprise Systems} multimode fiber optic
                 technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "553--576",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes the first implementation of
                 optical fiber technology for the I/O channel
                 connections of the IBM Enterprise System Connection
                 (ESCON) Architecture. The ESCON optical link line rate
                 is 200 megabits per second and is capable of
                 transmission over distances of 3 km. The link is
                 composed of a serializer, electro-optic transmitter,
                 duplex fiber optic cable, electro-optic receiver, and
                 deserializer. The serializer and deserializer
                 respectively perform the conversions from parallel to
                 serial and serial to parallel formats. The clock which
                 is used to retime the serial data in the deserializer
                 is extracted from the encoded serial signal using a
                 phase-locked loop (PLL) technique. The optical link
                 technology selected to achieve the data processing
                 system requirements is InGaAsP-InP 1300-nm LED,
                 InGaAsP-InP PIN photodiode, and multimode optical
                 fiber. A duplex fiber jumper cable is designed with a
                 rugged, low profile, polarized connector, with a unique
                 protective cap which recedes as it is mated. The
                 optical link loss budget is determined by dividing the
                 link into two major categories: available optical power
                 and cable plant loss. The link design ensures that the
                 minimum available power is greater than the maximum
                 cable plant loss. The design parameters and trade-offs
                 of the optical link are discussed. Unique measurement
                 techniques and tools to ensure reliable and consistent
                 link performance are described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  chemicalindex = "InGaAsP-InP/int InGaAsP/int InP/int As/int Ga/int
                 In/int P/int InGaAsP/ss As/ss Ga/ss In/ss P/ss InP/bin
                 In/bin P/bin",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); C5620L (Local area networks)",
  classification = "B6210L (Computer communications); B6260 (Optical
                 links and equipment); C5620L (Local area networks)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "200 Mbit/s; clock; Clock; deserializer; Deserializer;
                 duplex fiber; duplex fiber jumper cable; Duplex fiber
                 jumper cable; Duplex fiber optic cable; electro-optic
                 receiver; Electro-optic receiver; electro-optic
                 transmitter; Electro-optic transmitter; encoded serial
                 signal; Encoded serial signal; ESCON; I/O channel
                 connections; IBM Enterprise System Connection;
                 InGaAsP-InP; local area networks; measurement
                 techniques; Measurement techniques; multimode fiber
                 optic technology; Multimode fiber optic technology;
                 optic cable; optical fiber technology; Optical fiber
                 technology; optical link; Optical link technology;
                 optical links; phase-locked loop; Phase-locked loop;
                 photodiode; Photodiode; serializer; Serializer;
                 technology",
  numericalindex = "Bit rate 2.0E+08 bit/s",
  thesaurus =    "Local area networks; Optical links",
  treatment =    "P Practical",
}

@Article{Elliott:1992:IES,
  author =       "J. C. Elliott and M. W. Sachs",
  title =        "The {IBM Enterprise Systems Connection} ({ESCON})
                 Architecture",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "577--591",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM Enterprise Systems Connection (ESCON)
                 Architecture is the architecture for the new fiber
                 optic serial-I/O channels for the processors in the IBM
                 System/390 family. The architecture is based on message
                 exchanges, which replace the byte-oriented protocols of
                 the predecessor parallel interface architecture. Its
                 interconnection topology employs a dynamic crosspoint
                 switch. The paper describes the major functional
                 components of the architecture and discusses some of
                 the technical problems that were solved during its
                 development.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); C5620L (Local area networks)",
  classification = "B6210L (Computer communications); B6260 (Optical
                 links and equipment); C5620L (Local area networks)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Dynamic crosspoint switch; dynamic crosspoint switch;
                 ESCON; fiber optic serial-; Fiber optic serial-I/O
                 channels; I/O channels; IBM computers; IBM Enterprise
                 Systems Connection; IBM System/390; interconnection
                 topology; Interconnection topology; local area
                 networks; Message exchanges; message exchanges; optical
                 links",
  thesaurus =    "IBM computers; Local area networks; Optical links",
  treatment =    "P Practical; R Product Review",
}

@Article{Georgiou:1992:IES,
  author =       "C. J. Georgiou and T. A. Larsen and P. W. Oakhill and
                 B. Salimi",
  title =        "The {IBM Enterprise Systems Connection ({ESCON})
                 Director}: a dynamic switch for 200{Mb/s} fiber optic
                 links",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "593--616",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper describes the function and hardware
                 structure of the Enterprise Systems Connection (ESCON)
                 Director, an I/O switch capable of providing dynamic,
                 nonblocking, any-to-any connectivity for up to 60 fiber
                 optic links operating at 200 Mb/s. Optoelectronic
                 conversion at the switch ports allows the switching of
                 the fiber optic links to be done electronically. The
                 establishment of paths in the switching matrix is done
                 by means of a hard-wired, pipelined controller at a
                 maximum rate of five million connections/disconnections
                 per second. Routing information is provided in the
                 header of data frames. The switch-port function,
                 switching matrix, and matrix controller were
                 implemented in the IBM 1-$\mu$m CMOS `standard cell'
                 technology. The paper discusses the system
                 interconnection philosophy, details of the data flow,
                 the switch hardware architecture, the design
                 methodology, and the approach to technology
                 implementation.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); B6230Y (Other switching centres);
                 C5620L (Local area networks); C5610N (Network
                 interfaces)",
  classification = "B6210L (Computer communications); B6230Y (Other
                 switching centres); B6260 (Optical links and
                 equipment); C5610N (Network interfaces); C5620L (Local
                 area networks)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "200; 200 Mbit/s; CMOS; Connection; controller; data
                 frames; Data frames; dynamic switch; Dynamic switch;
                 Enterprise Systems; Enterprise Systems Connection;
                 ESCON; fiber optic links; Fiber optic links; I/O
                 switch; local area networks; matrix; Matrix controller;
                 Mbit/s; network interfaces; optical links; optical
                 switches; pipelined; Pipelined controller; switch-port
                 function; Switch-port function; switching matrix;
                 Switching matrix; system interconnection philosophy;
                 System interconnection philosophy",
  numericalindex = "Bit rate 2.0E+08 bit/s",
  thesaurus =    "Local area networks; Network interfaces; Optical
                 links; Optical switches",
  treatment =    "P Practical",
}

@Article{Flanagan:1992:IES,
  author =       "J. R. Flanagan and T. A. Gregg and D. F. Casper",
  title =        "The {IBM Enterprise Systems Connection (ESCON)}
                 channel --- a versatile building block",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "617--632",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM Enterprise Systems Connection (ESCON)
                 environment required the design of a single channel
                 that could be attached to the entire line of Enterprise
                 System/9000 processors and deliver the performance
                 required by the top of that line. In addition to the
                 channel, other functions were needed, such as the ESCON
                 channel-to-channel adapter. All of these functions were
                 required to be implemented using the same channel
                 hardware. The paper describes the key elements of the
                 IBM ESCON channel design.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); C5620L (Local area networks)",
  classification = "B6210L (Computer communications); B6260 (Optical
                 links and equipment); C5620L (Local area networks)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "channel-to-channel adapter; Channel-to-channel
                 adapter; Enterprise; Enterprise System/9000; ESCON; IBM
                 Enterprise Systems Connection; local area networks;
                 optical links; System/9000",
  thesaurus =    "Local area networks; Optical links",
  treatment =    "P Practical",
}

@Article{Cwiakala:1992:MDR,
  author =       "R. Cwiakala and J. D. Haggar and H. M. Yudenfriend",
  title =        "{MVS Dynamic Reconfiguration Management}",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "633--646",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper presents an overview of the dynamic
                 reconfiguration management (DRM) function of MVS/ESA
                 and its support of the IBM Enterprise System/9000
                 family of machines. Dynamic reconfiguration management
                 is the ability to select a new I/O configuration
                 definition without needing to perform a power-on reset
                 (POR) of the hardware or an initial program load (IPL)
                 of the MVS operating system. Dynamic reconfiguration
                 management allows the installation to add, delete, or
                 modify definitions for channel paths, control units,
                 and I/O devices, in both the software and hardware I/O
                 configurations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C6150N (Distributed systems)",
  classification = "C6150N (Distributed systems)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "channel paths; Channel paths; control units; Control
                 units; dynamic reconfiguration management; Dynamic
                 reconfiguration management; Enterprise System/9000;
                 ESCON; I/O configuration; IBM; IBM Enterprise
                 System/9000; initial program load; Initial program
                 load; MVS/ESA; network operating systems; operating
                 system; Operating system; power-on reset; Power-on
                 reset",
  thesaurus =    "Network operating systems",
  treatment =    "P Practical",
}

@Article{Coleman:1992:FDD,
  author =       "J. J. Coleman and C. B. Meltzer and J. L. Weiner",
  title =        "{Fiber Distributed Data Interface} attachment to
                 {System}\slash 390",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "647--654",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A fundamental standard that enables System/390 to
                 participate in heterogeneous systems environments is
                 the Fiber Distributed Data Interface (FDDI), defined by
                 ANSI. The initial IBM offering in support of FDDI is
                 attachment to System/390 machines via the 3172
                 Interconnect Controller. FDDI provides a
                 high-performance alternative to lower-speed local area
                 networks (LANs) for attachment of workstations to
                 System/390 mainframes. A key feature of the 3172 Micro
                 Channel (MC) controller is its internal bus structure,
                 derived from PS/2 technology. The 3172 FDDI adapter is
                 capable of data rates up to 80 megabytes per second
                 (MBps). This should be sufficient to support multiple
                 FDDI LANs at their rated speed of 10 MBps. Also,
                 because of its MC orientation, the 3172 FDDI adapter is
                 potentially extendable to other platforms derived from
                 PS/2 and RISC System/6000 technology.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Kingston, NY, USA",
  classcodes =   "B6210L (Computer communications); B6260 (Optical links
                 and equipment); C5620L (Local area networks); C5610N
                 (Network interfaces)",
  classification = "B6210L (Computer communications); B6260 (Optical
                 links and equipment); C5610N (Network interfaces);
                 C5620L (Local area networks)",
  corpsource =   "IBM Enterprise Syst., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3172 FDDI adapter; 3172 Interconnect Controller; 3172
                 Micro Channel; 80 MByte/s; data rates; Data rates;
                 FDDI; Fiber Distributed Data Interface; heterogeneous;
                 Heterogeneous systems environments; internal bus;
                 Internal bus structure; local area networks; Local area
                 networks; network interfaces; open systems; optical
                 links; PS/2 technology; structure; System/390; systems
                 environments",
  numericalindex = "Byte rate 8.0E+07 Byte/s",
  thesaurus =    "FDDI; Local area networks; Network interfaces; Open
                 systems; Optical links",
  treatment =    "P Practical",
}

@Article{Dhondy:1992:CTC,
  author =       "Noshir R. Dhondy and Richard J. Schmalz and Ronald M.
                 {Smith, Sr.} and Julian Thomas and Phil Yeh",
  title =        "Coordination of time-of-day clocks among multiple
                 systems",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "655--665",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM Enterprise Systems Architecture/390
                 External-Time-Reference (ETR) architecture facilitates
                 the synchronization of time-of-day (TOD) clocks to
                 ensure consistent time-stamp data in an installation
                 with multiple systems. The ETR architecture also
                 provides a means by which the TOD clocks can be set
                 automatically, without human intervention, to an
                 accurate standard time source. The paper reviews the
                 design considerations involved in providing these
                 functions along with `clock integrity' and continuous
                 operation-as a consistent extension of the System/390
                 TOD-clock architecture. The paper also provides a
                 functional description of the IBM 9037 Sysplex Timer,
                 which is an implementation of the sending unit of the
                 ETR network.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Kingston, NY, USA",
  classcodes =   "C6150N (Distributed systems); C6150E (General utility
                 programs); C5620L (Local area networks)",
  classification = "C5620L (Local area networks); C6150E (General
                 utility programs); C6150N (Distributed systems)",
  corpsource =   "IBM Enterprise Syst., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Architecture/390; External-Time-Reference; IBM 9037
                 Sysplex Timer; IBM Enterprise Systems; IBM Enterprise
                 Systems Architecture/390; local area networks; Multiple
                 systems; multiple systems; network operating systems;
                 synchronisation; synchronization; Synchronization;
                 Time-of-day clocks; time-of-day clocks; time-stamp
                 data; Time-stamp data; utility programs",
  thesaurus =    "Local area networks; Network operating systems;
                 Synchronisation; Utility programs",
  treatment =    "P Practical",
}

@Article{Swanson:1992:MEC,
  author =       "M. D. Swanson and C. P. Vignola",
  title =        "{MVS\slash ESA} coupled-systems considerations",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "667--682",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "One of the most important future MVS environments will
                 be to provide on-line transaction processing and
                 decision support through the use of large data
                 `warehouses' in heterogeneous networks. To provide the
                 large capacity and high availability required for this
                 environment, it will be necessary to use multiple,
                 cooperating MVS systems to provide those services. The
                 design of such coupled MVS systems must accommodate a
                 number of factors related to both the general
                 environment and the user's needs, including
                 availability, growth, granularity and scale, systems
                 management, migration and coexistence, and
                 single-system images. The authors describe the system
                 services available with MVS/ESA SP Version 4 that can
                 support the coupled-systems environment, and discuss
                 how those services can be exploited.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C6150N (Distributed systems)",
  classification = "C6150N (Distributed systems)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "4; coupled-systems environment; Coupled-systems
                 environment; decision support; Decision support;
                 heterogeneous networks; Heterogeneous networks; MVS
                 environments; MVS/ESA SP Version; MVS/ESA SP Version 4;
                 network operating systems; system services; System
                 services; transaction processing; Transaction
                 processing",
  thesaurus =    "Network operating systems",
  treatment =    "P Practical",
}

@Article{Smith:1992:ICF,
  author =       "R. M. {Smith, Sr.} and P. C. Yeh",
  title =        "{Integrated Cryptographic Facility} of the {Enterprise
                 Systems Architecture\slash 390}: design
                 considerations",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "683--693",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The paper reviews the considerations that shaped the
                 design of the Enterprise Systems Architecture/390
                 Integrated Cryptographic Facility. It describes design
                 issues, alternatives, and decisions, and it provides
                 the rationale behind some of the decisions. Issues
                 related to performance, security, usability, and
                 availability are covered.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "B6210L (Computer communications); B6120B (Codes);
                 C5620L (Local area networks); C6150N (Distributed
                 systems); C6130E (Data interchange)",
  classification = "B6120B (Codes); B6210L (Computer communications);
                 C5620L (Local area networks); C6130E (Data
                 interchange); C6150N (Distributed systems)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Architecture/390; availability; Availability;
                 Cryptographic Facility; cryptography; Enterprise
                 Systems; Integrated; Integrated Cryptographic Facility;
                 local area networks; network operating systems;
                 performance; Performance; security; Security;
                 usability; Usability",
  thesaurus =    "Cryptography; Local area networks; Network operating
                 systems",
  treatment =    "P Practical",
  xxauthor =     "R. M. {Smith, Jr.} and P. C. Yeh",
}

@Article{Gibson:1992:DIS,
  author =       "D. H. Gibson and G. S. Rao",
  title =        "Design of the {IBM System}\slash 390 computer family
                 for numerically intensive applications: An overview for
                 engineers and scientists",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "695--711",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM System/390, (S/390) computer family provides a
                 two-order-of-magnitude performance range for
                 numerically intensive applications. The engineer or
                 scientist can use the same operating system, compiler,
                 and run-time environment commonly across the family.
                 The paper provides an overview of primary S/390
                 hardware and software products of interest for
                 numerically intensive applications, including MVS/ESA,
                 VM/ESA, AIX/ESA, and the extension of FORTRAN for very
                 large applications and parallel applications. The paper
                 is focused on details of design interest in three
                 specific hardware products within the S/390 family,
                 with emphasis on the Enterprise System/9000 (ES/9000)
                 Model 900. Also described is a potential
                 parallel-computing configuration using the ESCON
                 Director. The paper concludes with a discussion of the
                 generic system environments within which S/390 products
                 can support the technical user.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "C5420 (Mainframes and minicomputers)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AIX/ESA; applications; compiler; Compiler; computer
                 evaluation; Enterprise; Enterprise System/9000;
                 environment; ES/9000; ESCON Director; FORTRAN; IBM
                 computers; IBM System/390; mainframes; MVS/ESA;
                 numerically intensive; Numerically intensive
                 applications; Operating system; operating system;
                 parallel-computing configuration; Parallel-computing
                 configuration; Performance range; performance range;
                 run-time; Run-time environment; System/9000; VM/ESA",
  thesaurus =    "Computer evaluation; IBM computers; Mainframes",
  treatment =    "P Practical; R Product Review",
}

@Article{Liptay:1992:DIE,
  author =       "J. S. Liptay",
  title =        "Design of the {IBM Enterprise System}\slash 9000
                 high-end processor",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "713--731",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The `high-end' water-cooled processors in the IBM
                 Enterprise System/9000 product family use a CPU
                 organization and cache structure which depart
                 significantly from previous designs. The CPU
                 organization includes multiple execution elements which
                 execute instructions out of sequence, and uses a new
                 virtual register management algorithm to control them.
                 It also contains a branch history table to remember
                 recent branches and their target addresses so that
                 instruction fetching and decoding can be directed more
                 accurately. These models also use a two-level cache
                 structure which provides a level 1 cache associated
                 with each processor and a level 2 cache associated with
                 central storage. The level 1 cache uses a store-through
                 organization, and is split into two separate caches,
                 one used for instruction fetching and the other for
                 operand references. The level 2 cache uses a store-in
                 method to handle stores.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers)",
  classification = "C5420 (Mainframes and minicomputers)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Branch history table; branch history table; buffer
                 storage; cache structure; Cache structure; computer
                 evaluation; CPU organization; Decoding; decoding;
                 fetching; high-end processor; High-end processor; IBM
                 computers; IBM Enterprise System/9000; instruction;
                 Instruction fetching; mainframes; operand; Operand
                 references; processors; references; register
                 management; Store-through organization; store-through
                 organization; virtual; Virtual register management;
                 water-cooled; Water-cooled processors",
  thesaurus =    "Buffer storage; Computer evaluation; IBM computers;
                 Mainframes",
  treatment =    "P Practical; R Product Review",
}

@Article{Dao-Trong:1992:SCI,
  author =       "S. Dao-Trong and K. Helwig",
  title =        "A single-chip {IBM} System\slash 390 floating-point
                 processor in {CMOS}",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "733--749",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A floating-point processor with the IBM System\slash
                 390 architecture is implemented in one CMOS VLSI chip
                 containing over 70000 cells (equivalent inverters),
                 using a transistor channel length of 0.5 mu m. All
                 floating-point instructions are hard-wired, including
                 the binary integer multiplications. The chip is
                 implemented in a 1- mu m technology with three layers
                 of metal. All circuits are realized in standard cells
                 except for a floating-point register and a multiplier
                 array macro, which are custom designed to save chip
                 area. Instructions are performed in a five-stage
                 pipeline with a maximum operating frequency of 37 MHz.
                 The chip measures 12.7 mm*12.7 mm, and dissipates 2 W.
                 It is part of the chip set which forms the core of the
                 IBM Enterprise System\slash 9000 Type 9221 entry-level
                 models.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Germany, Boeblingen, Germany",
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5130 (Microprocessor
                 chips); C5230 (Digital arithmetic methods)",
  classification = "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5130 (Microprocessor
                 chips); C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Germany, Boeblingen, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "37 MHz; binary; Binary integer multiplications; chip
                 set; Chip set; CMOS; CMOS integrated circuits; digital
                 arithmetic; Enterprise System/9000; equipment;
                 equivalent inverters; Equivalent inverters; evaluation;
                 five-stage pipeline; Five-stage pipeline; IBM; IBM
                 computers; IBM Enterprise System/9000; IBM Enterprise
                 System\slash 9000; integer multiplications;
                 microprocessor chips; single-chip IBM system/390
                 floating-point processor; Single-chip IBM System/390
                 floating-point processor; Single-chip IBM System\slash
                 390 floating-point processor; transistor channel
                 length; Transistor channel length",
  numericalindex = "Frequency 3.7E+07 Hz",
  thesaurus =    "CMOS integrated circuits; Digital arithmetic;
                 Equipment evaluation; IBM computers; Microprocessor
                 chips",
  treatment =    "P Practical; R Product Review",
}

@Article{Ackerman:1992:SIE,
  author =       "D. F. Ackerman and M. H. Decker and J. J. Gosselin and
                 K. M. Lasko and M. P. Mullen and R. E. Rosa and E. V.
                 Valera and B. Wile",
  title =        "Simulation of {IBM Enterprise System\slash 9000}
                 models 820 and 900",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "751--764",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The discovery and removal of logic design errors early
                 in the development cycle is critical to timely
                 availability of market-driven processor products. The
                 paper describes the part played by simulation in the
                 verification of the high-end models of the IBM
                 Enterprise System/9000 (ES/9000) processor family, and
                 how that effort advanced the state of the art of logic
                 design simulation. The increased complexity of the
                 ES/9000 design over that of the IBM Enterprise
                 System/3090 (ES/3090) necessitated a larger simulation
                 effort. New tools and methods were developed. Two
                 simulation missions were established. Element
                 simulation addressed ES/9000 functional elements (e.g.
                 the storage controller) individually using the Compiled
                 Enhanced Functional Simulator (CEFS), a software tool.
                 System simulation tested two or more functional
                 elements together using the Engineering Verification
                 Engine (EVE), a special-purpose hardware parallel
                 processor, and an attached IBM 3092 Processor
                 Controller (PCE). The results achieved by simulation
                 are discussed, together with the methods used and the
                 impact these results had on the overall verification of
                 the ES/9000 Models 820 and 900.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5470 (Performance evaluation and testing); C7430
                 (Computer engineering); C5210 (Logic design methods);
                 C5420 (Mainframes and minicomputers)",
  classification = "C5210 (Logic design methods); C5420 (Mainframes and
                 minicomputers); C5470 (Performance evaluation and
                 testing); C7430 (Computer engineering)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Compiled Enhanced Functional Simulator; computer
                 testing; development cycle; Development cycle;
                 Engineering Verification Engine; formal verification;
                 high-end models; High-end models; IBM computers; logic;
                 logic design errors; Logic design errors; logic design
                 simulation; Logic design simulation; mainframes;
                 simulation; Simulation; software tool; Software tool;
                 storage controller; Storage controller; testing;
                 verification; Verification; virtual machines",
  thesaurus =    "Computer testing; Formal verification; IBM computers;
                 Logic testing; Mainframes; Virtual machines",
  treatment =    "P Practical",
}

@Article{Chen:1992:FDI,
  author =       "C. L. Chen and N. N. Tendolkar and A. J. Sutton and M.
                 Y. Hsiao and D. C. Bossen",
  title =        "Fault-tolerance design of the {IBM Enterprise
                 System\slash 9000} type 9021 processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "765--779",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The 9021-type processors offer the highest performance
                 of the IBM Enterprise System/9000 (ES/9000) series.
                 They also have the highest levels of concurrent error
                 detection, fault isolation, recovery, and availability
                 of any IBM general-purpose processor. High availability
                 is achieved by minimizing component failure rates
                 through improvements of the base technology, and design
                 techniques that permit hard and soft failure detection,
                 recovery and isolation, and component replacement
                 concurrent with system operation. The authors discuss
                 fault-tolerant design techniques for array, logic, and
                 storage subsystems. They also present diagnostic
                 strategy, fault isolation, and recovery techniques. New
                 features such as the redundant power system and
                 Processor Availability Facility are described. The
                 overall recovery design is described, as well as
                 specific implementation schemes. The design process to
                 verify the error detection, fault isolation, and
                 recovery is also described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5470 (Performance evaluation and testing); C5420
                 (Mainframes and minicomputers)",
  classification = "C5420 (Mainframes and minicomputers); C5470
                 (Performance evaluation and testing)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "9021 processors; 9021 Processors; array; Array;
                 availability; Availability; concurrent error detection;
                 Concurrent error detection; diagnostic strategy;
                 Diagnostic strategy; ES/9000; fault isolation; Fault
                 isolation; fault tolerant computing; fault-tolerant
                 design techniques; Fault-tolerant design techniques;
                 IBM computers; IBM Enterprise System/9000; mainframes;
                 Processor Availability Facility; rates; Rates;
                 recovery; Recovery; recovery design; Recovery design;
                 redundant power system; Redundant power system;
                 system",
  thesaurus =    "Fault tolerant computing; IBM computers; Mainframes;
                 System recovery",
  treatment =    "P Practical",
}

@Article{Covi:1992:TFC,
  author =       "K. R. Covi",
  title =        "Three-loop feedback control of fault-tolerant power
                 supplies in {IBM Enterprise System\slash 9000}
                 processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "781--789",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In an Enterprise System/9000 (ES/9000) processor, a
                 fault-tolerant power system composed a multiple power
                 supplies connected in parallel provides thousands of
                 amperes of current to low-voltage (1-2 V) logic circuit
                 boards, monitors the voltage at each board, and
                 immediately responds to compensate for failure of a
                 supply. If a supply fails, the very fast closed-loop
                 response redistributes the current uniformly among the
                 remaining supplies and allows the normal functioning of
                 the processor logic to continue uninterrupted. This
                 rapid response is not obtained from a conventional
                 two-loop (current-mode) feedback power supply because
                 the loop bandwidth is restricted by a resonance that
                 develops in the power distribution. A third feedback
                 loop that is added to each supply controls this power
                 distribution resonance and makes possible the wide loop
                 bandwidth necessary to achieve the required power
                 system control. Analysis is presented of a three-loop
                 control system, and a simulation of its application to
                 a typical ES/9000 power system is described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Kingston, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers); C5150 (Other
                 circuits for digital computers); C5470 (Performance
                 evaluation and testing)",
  classification = "C5150 (Other circuits for digital computers); C5420
                 (Mainframes and minicomputers); C5470 (Performance
                 evaluation and testing)",
  corpsource =   "IBM Enterprise Syst., Kingston, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bandwidth; boards; Enterprise System/9000 processors;
                 ES/9000; fault tolerant computing; fault-tolerant power
                 supplies; Fault-tolerant power supplies; feedback
                 control; Feedback control; IBM; IBM computers; IBM
                 Enterprise System/9000 processors; logic circuit; Logic
                 circuit boards; loop; Loop bandwidth; mainframes;
                 monitors; Monitors; power; supplies to apparatus;
                 three-loop control system; Three-loop control system;
                 very fast closed-loop response; Very fast closed-loop
                 response",
  thesaurus =    "Fault tolerant computing; IBM computers; Mainframes;
                 Power supplies to apparatus",
  treatment =    "P Practical",
}

@Article{Delia:1992:SCD,
  author =       "D. J. Delia and T. C. Gilgert and N. H. Graham and U.
                 Hwang and P. W. Ing and J. C. Kan and R. G. Kemink and
                 G. C. Maling and R. F. Martin and K. P. Moran and J. R.
                 Reyes and R. R. Schmidt and R. A. Steinbrecher",
  title =        "System cooling design for the water-cooled {IBM
                 Enterprise System\slash 9000} processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "791--803",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The high operating speed and corresponding high chip
                 heat fluxes in the IBM Enterprise System/9000
                 water-cooled mainframe processors are made possible by
                 improvements in component- and system-level cooling.
                 The heart of the closed-loop water-cooling system is a
                 coolant distribution frame (CDF) common to all
                 water-cooled processors. The CDF provides a controlled
                 water temperature of 21.7 degrees C to the central
                 electronic complex (CEC) at water flow rates up to 245
                 liters per minute (lpm) and rejects heat loads of up to
                 63 kW for the largest processor. The water flow
                 provides cooling to multichip thermal conduction
                 modules (TCMs), to power supplies, and to air-to-water
                 heat exchangers that provide preconditioned air to
                 channel and memory cards. As many as 121 chips are
                 mounted on a TCM glass-ceramic substrate, with chip
                 powers reaching 27 W or a heat flux of 64 W/cm/sup 2/.
                 A separable cold plate was developed to cool these
                 modules. The power supplies with high heat densities
                 are primarily cooled by water which flows through a
                 unique separable cold plate designed for ease of
                 serviceability of the power supply. A closed-loop frame
                 in which all the heat was rejected to water was
                 developed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers); C5490 (Other
                 aspects)",
  classification = "C5420 (Mainframes and minicomputers); C5490 (Other
                 aspects)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "21.7 deg C; central electronic; Central electronic
                 complex; ceramic substrate; closed-loop water-cooling;
                 Closed-loop water-cooling system; cold plate; Cold
                 plate; complex; coolant distribution frame; Coolant
                 distribution frame; cooled mainframe processors;
                 cooling; heat flux; Heat flux; IBM computers;
                 mainframes; multichip thermal conduction modules;
                 Multichip thermal conduction modules; system; TCM
                 glass-; TCM glass-ceramic substrate; water-;
                 water-cooled IBM Enterprise System/9000 processors;
                 Water-cooled IBM Enterprise System/9000 processors;
                 Water-cooled mainframe processors",
  numericalindex = "Temperature 2.95E+02 K",
  thesaurus =    "Cooling; IBM computers; Mainframes",
  treatment =    "P Practical",
}

@Article{Goth:1992:DDM,
  author =       "G. F. Goth and M. L. Zumbrunnen and K. P. Moran",
  title =        "Dual-tapered-piston ({DTP}) module cooling for {IBM
                 Enterprise System\slash 9000} systems",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "4",
  pages =        "805--816",
  month =        jul,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The water-cooled thermal conduction modules (TCMs) in
                 the IBM Enterprise System/9000 (ES/9000) systems
                 require a fourfold thermal improvement over TCMs in the
                 3090 system. An examination of the thermal/mechanical
                 tolerance relationships among the chips, substrate, and
                 cooling hardware showed that a cylindrical piston would
                 not meet this requirement. The piston was redesigned
                 with a cylindrical center section and a taper on each
                 end. This shape minimizes the gap between the piston
                 and `hat' while retaining intimate contact between the
                 piston face and chip surface during all assembly
                 conditions. Numerical and analytical models demonstrate
                 that this new piston shape, coupled with improved
                 conductivity of the cooling hardware materials, exceeds
                 ES/9000 system needs. These models were verified by
                 tests conducted on single-site and full-scale modules
                 in the laboratory and by tests on actual ES/9000
                 systems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "C5420 (Mainframes and minicomputers); C5490 (Other
                 aspects)",
  classification = "C5420 (Mainframes and minicomputers); C5490 (Other
                 aspects)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chips; Chips; cooling; cooling hardware; Cooling
                 hardware; cylindrical piston; Cylindrical piston;
                 ES/9000; IBM computers; IBM Enterprise; IBM Enterprise
                 System/9000; mainframes; substrate; Substrate;
                 System/9000; water-cooled thermal conduction modules;
                 Water-cooled thermal conduction modules",
  thesaurus =    "Cooling; IBM computers; Mainframes",
  treatment =    "P Practical",
}

@Article{Attardo:1992:PES,
  author =       "M. J. Attardo",
  title =        "Preface: {ES\slash 9000} Semiconductor and Packaging
                 Technologies",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "819--820",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue ``ES\slash 9000 semiconductor and
                 packaging technologies''.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brown:1992:ASA,
  author =       "K. H. Brown and D. A. Grose and R. C. Lange and T. H.
                 Ning and P. A. Totta",
  title =        "Advancing the state of the art in high-performance
                 logic and array technology",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "821--828",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "High-speed silicon bipolar technology continues to
                 meet the demands of integrated circuits for mainframe
                 computers. IBM has developed an advanced bipolar logic
                 and high-speed array technology for its Enterprise
                 System/9000 systems. This technology, code-named ATX-4,
                 is composed of trench-isolated, double-polysilicon
                 self-aligned bipolar devices, and has four fully
                 planarized wiring levels with interlevel connecting
                 studs. Chip fabrication has been implemented in
                 1-$\mu$m ground rules and is in full-scale
                 manufacturing. ATX-4 represents a significant advance
                 in providing higher-speed and lower-power logic at
                 increased levels of integration compared with that of
                 the ATX-1 technology used in previous generations. An
                 overview of the design and integration of ATX-4 is
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits)C5120 (Logic and switching circuits); C5420
                 (Mainframes and minicomputers)",
  classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits); C5120 (Logic and switching circuits); C5420
                 (Mainframes and minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1 micron; 1 Micron; ATX-4; bipolar integrated
                 circuits; chip fabrication; Chip fabrication; double;
                 Double polycrystalline Si devices; full-scale
                 manufacturing; Full-scale manufacturing; ground rules;
                 Ground rules; high speed; High speed Si bipolar logic;
                 high-; High-performance logic; high-speed array
                 technology; High-speed array technology; IBM computers;
                 IBM Enterprise System/9000; integration levels;
                 Integration levels; interlevel connecting studs;
                 Interlevel connecting studs; isolated self aligned
                 bipolar devices; logic arrays; mainframes; performance
                 logic; planarized wiring levels; Planarized wiring
                 levels; polycrystalline Si devices; Si bipolar logic;
                 trench; Trench isolated self aligned bipolar devices;
                 wiring",
  numericalindex = "Size 1.0E-06 m",
  thesaurus =    "Bipolar integrated circuits; IBM computers; Logic
                 arrays; Mainframes; Wiring",
  treatment =    "P Practical",
}

@Article{Barish:1992:IPI,
  author =       "A. E. Barish and J. P. Eckhardt and M. D. Mayo and W.
                 A. Svarczkopf and S. P. Gaur",
  title =        "Improved performance of {IBM Enterprise System}\slash
                 9000 bipolar logic chips",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "829--834",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The performance required for logic gate arrays by the
                 IBM Enterprise System/9000 (ES/9000) family of
                 water-cooled processors was obtained by redesigning
                 chips that previously consisted of emitter-coupled
                 logic (ECL) circuits. Multiple bipolar logic circuit
                 families were implemented for the first time on a
                 single IBM chip by using a modular cell approach. In
                 60\% of the ECL circuits, AC coupling in ECL gates
                 reduced the maximum operating power per ECL circuit on
                 ES/9000 chips by 50\% and decreased the signal delay
                 per loaded gate by 30\%, to 150 ps. About 10-20\% of
                 the remaining ECL circuits were replaced by
                 differential current switches (DCS) which dissipated
                 less power and improved the overall chip performance.
                 Circuits to communicate between ECL and DCS circuit
                 families and to improve DCS circuit reliability were
                 included on the ES/9000 chips without affecting logic
                 function density.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits)C5120 (Logic and switching circuits); C5420
                 (Mainframes and minicomputers)",
  classification = "B1265B (Logic circuits); B2570B (Bipolar integrated
                 circuits); C5120 (Logic and switching circuits); C5420
                 (Mainframes and minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arrays; bipolar integrated circuits; bipolar logic
                 chips; Bipolar logic chips; chip performance; Chip
                 performance; circuit reliability; Circuit reliability;
                 coupled logic; delays; differential current;
                 Differential current switches; ECL gates; emitter-;
                 Emitter-coupled logic; function density; IBM computers;
                 IBM Enterprise System/9000; logic; Logic function
                 density; logic gate arrays; Logic gate arrays;
                 mainframes; maximum; Maximum operating power; modular
                 cell approach; Modular cell approach; operating power;
                 power dissipation; Power dissipation; signal delay;
                 Signal delay; switches; water-cooled processors;
                 Water-cooled processors",
  thesaurus =    "Bipolar integrated circuits; Delays; IBM computers;
                 Logic arrays; Mainframes",
  treatment =    "P Practical",
}

@Article{Booth:1992:SAQ,
  author =       "R. M. {Booth, Jr.} and K. A. Tallman and T. J.
                 Wiltshire and P. L. Yee",
  title =        "A statistical approach to quality control of
                 non-normal lithographical overlay distributions",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "835--844",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "To achieve the high reliability and performance
                 required by integrated circuit chips in IBM Enterprise
                 System/9000 processors, lithography tool centerline
                 overlay variations between masking levels were
                 specified at +or-0.3$\mu$m, and circuit design images
                 were transferred with 5* step-and-repeat
                 photolithography tools. In contrast to data obtained
                 from 1* lithography tools, the level-to-level overlay
                 data which characterize deviations from circuit design
                 rules did not fit a normal distribution, and quality
                 control was not achieved with traditional statistical
                 procedures. A methodology was empirically developed
                 which transformed measured data into worst-case overlay
                 points and approximated the data by a gamma
                 distribution. More than 80\% of the worst-case
                 distributions were fit by the gamma distribution. The
                 transformation of chip worst-case overlay data and the
                 quality control testing applicable to 5*
                 step-and-repeat lithography tool processes are
                 described in this paper.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); B0170L (Inspection and quality control)",
  classification = "B0170L (Inspection and quality control); B2550G
                 (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit; circuit chips; circuit design images; Circuit
                 design images; Circuit design rules; design rules;
                 gamma distribution; Gamma distribution; IBM computers;
                 IBM Enterprise System/9000 processors; integrated;
                 Integrated circuit chips; integrated circuit testing;
                 level-to-level overlay data; Level-to-level overlay
                 data; levels; lithography tool centerline overlay
                 variations; Lithography tool centerline overlay
                 variations; masking; Masking levels; nonnormal
                 distributions; Nonnormal distributions;
                 photolithography; photolithography tools; quality
                 control; quality control testing; Quality control
                 testing; statistical approach; Statistical approach;
                 statistics; step-and-repeat; Step-and-repeat
                 photolithography tools; worst-case overlay points;
                 Worst-case overlay points",
  thesaurus =    "IBM computers; Integrated circuit testing;
                 Photolithography; Quality control; Statistics",
  treatment =    "P Practical",
}

@Article{Guthrie:1992:FVB,
  author =       "W. L. Guthrie and W. J. Patrick and E. Levine and H.
                 C. Jones and E. A. Mehter and T. F. Houghton and G. T.
                 Chiu and M. A. Fury",
  title =        "A four-level {VLSI} bipolar metallization design with
                 chemical-mechanical planarization",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "845--857",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A high-performance four-level semiconductor device
                 wiring fabrication process has been developed for
                 bipolar devices in Enterprise System/9000 (ES/9000)
                 processors. The reliable interconnection of large
                 numbers of devices on a single integrated circuit chip
                 has been enhanced by planarizing insulators and metals
                 using chemical-mechanical polishing processes, by a
                 novel contact stud structure, and by a Ti-clad Al-Cu
                 metallurgy. This paper describes the structure of the
                 four-level wiring and elements of the process,
                 including the silicon contacts, techniques for
                 depositing metal and oxide to cover features with high
                 aspect ratios, high-temperature fine-line lift-off
                 stencils, and high-density, area array solder
                 terminals.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Ti/el; AlCu/bin Al/bin Cu/bin; Si/int Si/el",
  classcodes =   "B2550F (Metallisation); B2570B (Bipolar integrated
                 circuits)",
  classification = "B2550F (Metallisation); B2570B (Bipolar integrated
                 circuits)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AlCu metallurgy; array solder terminals; Array solder
                 terminals; aspect ratios; Aspect ratios; bipolar
                 integrated circuits; chemical-mechanical planarization;
                 Chemical-mechanical planarization; contact stud
                 structure; Contact stud structure; deposition;
                 Deposition techniques; four-level VLSI bipolar
                 metallization design; Four-level VLSI bipolar
                 metallization design; high-temperature fine-;
                 High-temperature fine-line lift-off stencils; IBM
                 computers; IBM Enterprise System/9000 processors;
                 insulators; Insulators; integrated circuit chip;
                 Integrated circuit chip; line lift-off stencils;
                 metallisation; metals; Metals; polishing; Polishing;
                 reliable interconnection; Reliable interconnection;
                 semiconductor device; Semiconductor device wiring
                 fabrication process; Si contacts; techniques; Ti
                 cladding; VLSI; wiring; wiring fabrication process",
  thesaurus =    "Bipolar integrated circuits; IBM computers;
                 Metallisation; VLSI; Wiring",
  treatment =    "P Practical",
}

@Article{Bunce:1992:DTM,
  author =       "P. Bunce and W. Chin and L. Clark and B. Krumm",
  title =        "{Directory} and {Trace} memory chip with active
                 discharge cell",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "859--865",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The Directory and Trace memory chip is a 7.1 Kb static
                 random-access memory with 28-bit field simultaneous
                 compare function and independent read and write 28-bit
                 field addressing. The array is organized as four 64 by
                 28 subarrays. It incorporates a unique Schottky barrier
                 diode (SBD)-coupled cell with active discharge. As
                 memory cells are reduced in size with each new
                 generation, soft errors become a major concern. One
                 method of providing high soft-error immunity is to
                 operate the memory cell transistors in the saturation
                 region. However, in order to write data into such
                 memory cells, the saturation capacitance in the memory
                 cell transistors must be discharged. In prior art, such
                 a capacitive transistor-saturation discharge was
                 accompanied by increased power consumption and/or
                 delay. Typically, the new data signals themselves are
                 used to overcome this saturation capacitance. In this
                 design, a unique SBD-coupled active discharge cell
                 discharges the conducting transistor saturation
                 capacitance before writing new data into the cell.
                 Thus, it enhances the write performance and preserves
                 the high soft-error immunity of the cell.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "B1265D (Memory circuits); C5320G (Semiconductor
                 storage)",
  classification = "B1265D (Memory circuits); C5320G (Semiconductor
                 storage)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "28-bit field; 28-Bit field simultaneous compare
                 function; 7.1; 7.1 Kbit; active discharge cell; Active
                 discharge cell; capacitance; capacitive
                 transistor-saturation; Capacitive transistor-saturation
                 discharge; cell transistors; coupled cell; Directory
                 and Trace; Directory and Trace memory chip; discharge;
                 independent read/write addressing; Independent
                 read/write addressing; integrated memory circuits;
                 kbit; memory; Memory cell transistors; memory chip;
                 partial discharges; saturation capacitance; Saturation
                 capacitance; Schottky barrier diode; Schottky barrier
                 diode coupled cell; simultaneous compare function;
                 soft-error immunity; Soft-error immunity; SRAM chips;
                 static random-access memory; Static random-access
                 memory; write performance; Write performance",
  numericalindex = "Storage capacity 7.3E+03 bit",
  thesaurus =    "Capacitance; Integrated memory circuits; Partial
                 discharges; SRAM chips",
  treatment =    "P Practical",
}

@Article{Chiu:1992:IES,
  author =       "K. Chiu and J. J. DeFazio and T. G. McNamara",
  title =        "{IBM Enterprise System}\slash 9000 clock system: a
                 technology and system perspective",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "867--875",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The minimization of system clock skew is critical to
                 the overall performance of high-speed computer systems.
                 This paper discusses the statistical clock skew
                 calculation methodology employed in the analysis of the
                 IBM Enterprise System/9000 (ES/9000) computer systems.
                 Comparisons made to a worst-case design approach show
                 the advantages of a statistical clock skew calculation
                 and its use in the timing analysis of ES/9000 systems.
                 Design techniques that aid in the minimization of
                 system clock skew are discussed throughout this paper.
                 While many details concerning these design techniques
                 and the statistical clock skew calculation methodology
                 are tutorial in nature and have been used in the design
                 of past IBM high-end machines, it is hoped that this
                 paper will give the reader a useful understanding of
                 the major considerations affecting the clock system and
                 its application to an ES/9000 system.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "C5150 (Other circuits for digital computers); C5420
                 (Mainframes and minicomputers)",
  classification = "C5150 (Other circuits for digital computers); C5420
                 (Mainframes and minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "clocks; High-speed computer systems; high-speed
                 computer systems; IBM computers; IBM Enterprise; IBM
                 Enterprise System/9000; mainframes; minimisation;
                 Minimization; minimization; performance; Performance;
                 Statistical calculation methodology; statistical
                 calculation methodology; statistics; System clock skew;
                 system clock skew; System/9000; timing analysis; Timing
                 analysis",
  thesaurus =    "Clocks; IBM computers; Mainframes; Minimisation;
                 Statistics",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Davidson:1992:PED,
  author =       "E. E. Davidson and P. W. Hardin and G. A. Katopis and
                 M. G. Nealon and L. L. Wu",
  title =        "Physical and electrical design features of the {IBM
                 Enterprise System}\slash 9000 circuit module",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "877--888",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The requirements of the new TCM (thermal conduction
                 module) for the IBM Enterprise System/9000 (ES/9000)
                 module generated a significant number of challenges for
                 the physical and electrical designer. For example, the
                 need to support more circuits meant that more signal
                 and power conductors had to be provided. In addition,
                 the requirement for faster performance called for
                 materials with lower dielectric constants and the use
                 of on-module decoupling capacitors. This paper
                 describes these changes, the design considerations that
                 were applied to signal transmission, and the approaches
                 that were used to contain delta-I and crosstalk noise
                 in the module. Finally, the test measurements used to
                 qualify the module are explained. The result is a TCM
                 that more than doubles the circuit density of the TCM
                 used for the IBM 3090 machines, with substantially
                 greater speed and reliability.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "B0170J (Product packaging); C5150 (Other circuits for
                 digital computers); C5420 (Mainframes and
                 minicomputers)",
  classification = "B0170J (Product packaging); C5150 (Other circuits
                 for digital computers); C5420 (Mainframes and
                 minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit density; Circuit density; circuit module;
                 Circuit module; crosstalk noise; Crosstalk noise;
                 decoupling capacitors; Decoupling capacitors; delta-I
                 noise; Delta-I noise; dielectric constants; Dielectric
                 constants; electrical design; Electrical design
                 features; Enterprise System/9000; features; heat
                 conduction; IBM; IBM 3090; IBM 3090 machines; IBM
                 computers; IBM Enterprise System/9000; machines;
                 mainframes; modules; multichip; noise; performance;
                 Performance; permittivity; physical design features;
                 Physical design features; power conductors; Power
                 conductors; reflection noise; Reflection noise;
                 reliability; Reliability; signal; signal conductors;
                 Signal conductors; Signal transmission; speed; Speed;
                 switching noise; Switching noise; thermal conduction
                 module; Thermal conduction module; transmission",
  thesaurus =    "Heat conduction; IBM computers; Mainframes; Multichip
                 modules; Noise; Permittivity",
  treatment =    "P Practical",
}

@Article{Tummala:1992:HPG,
  author =       "R. R. Tummala and J. U. Knickerbocker and S. H.
                 Knickerbocker and L. W. Herron and R. W. Nufer and R.
                 N. Master and M. O. Neisser and B. M. Kellner and C. H.
                 Perry and J. N. Humenik and T. F. Redmond",
  title =        "High-performance glass-ceramic\slash copper multilayer
                 substrate with thin-film redistribution",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "889--904",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "IBM has pioneered the use of large-area alumina
                 multilayer ceramic substrates using state-of-the-art
                 greensheet, molybdenum paste, and tooling technologies
                 for its mainframe computers since 1980. During this
                 time, a new generation of substrate materials have been
                 developed based on copper metallization and a unique
                 glass that crystallizes to cordierite (2Al$_2$O/sub
                 3/.2MgO.5SiO$_2$), which has a very low dielectric
                 constant. The glass-ceramic/copper system provides a
                 factor of 3 improvement in electrical conductivity over
                 alumina/molybdenum in previous IBM systems, and the
                 number of metallized substrate layers has been
                 increased from 45 to 63. The thermal expansion of the
                 new substrate (30*10/sup -7/ degrees C/sup -1/) is
                 matched with that of the silicon chips, thereby
                 enhancing the reliability of the 78500 solder-bonded
                 chip-to-substrate connections in the System
                 390-Enterprise System/9000 computers. Each substrate is
                 127.5 mm square and can support up to 121 complex logic
                 and memory chips. The IBM advanced multichip module
                 dissipates more than twice the heat flux of previous
                 alumina/multichip modules-to 17 W/cm/sup 2/ at the
                 package level and 50 W/cm/sup 2/ at the chip level.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Al2O3MgOSiO2-Cu/int Al2O3MgOSiO2/int Al2O3/int
                 SiO2/int Al2/int Al/int Cu/int Mg/int O2/int O3/int
                 Si/int O/int Al2O3MgOSiO2/ss Al2O3/ss SiO2/ss Al2/ss
                 Al/ss Mg/ss O2/ss O3/ss Si/ss O/ss Cu/el; Si/int
                 Si/el",
  classcodes =   "B2220J (Hybrid integrated circuits); B0170J (Product
                 packaging); B2220E (Thin film circuits); B0540
                 (Ceramics and refractories); B0550 (Composite
                 materials); B0570 (Glasses)",
  classification = "B0170J (Product packaging); B0540 (Ceramics and
                 refractories); B0550 (Composite materials); B0570
                 (Glasses); B2220E (Thin film circuits); B2220J (Hybrid
                 integrated circuits)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2/O/sub 3/MgOSiO$_2$-Cu; Advanced multichip module;
                 advanced multichip module; Al$_2$O/sub 3/MgOSiO$_2$-Cu;
                 Al/sub; aluminosilicate glasses; ceramics; chips;
                 composite insulating; connections; constant; cooling;
                 copper; Cordierite; cordierite; dielectric; Dielectric
                 constant; Electrical conductivity; electrical
                 conductivity; expansion; film redistribution;
                 Glass-ceramic; glass-ceramic; Heat flux dissipation;
                 heat flux dissipation; IBM computers; IBM System
                 390-Enterprise System/9000 computers; logic; Logic
                 chips; materials; Memory chips; memory chips;
                 metallisation; Metallization; metallization; multichip
                 modules; Multilayer substrate; multilayer substrate;
                 permittivity; Reliability; reliability; Si chips;
                 solder-bonded chip-to-substrate; Solder-bonded
                 chip-to-substrate connections; substrates; thermal;
                 Thermal expansion; thin film circuits; thin-; Thin-film
                 redistribution",
  thesaurus =    "Aluminosilicate glasses; Ceramics; Composite
                 insulating materials; Cooling; Copper; IBM computers;
                 Metallisation; Multichip modules; Permittivity;
                 Substrates; Thermal expansion; Thin film circuits",
  treatment =    "P Practical; X Experimental",
}

@Article{Kranik:1992:EAF,
  author =       "J. R. Kranik and J. J. Fulton and L. Su and S. M.
                 Zimmerman",
  title =        "Equipment-related advances in the fabrication of
                 glass-ceramic\slash copper\slash polyimide substrates",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "905--920",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper pertains to the equipment used to produce
                 the multilayer glass-ceramic/copper/polyimide
                 substrates of the thermal conduction modules (TCMs)
                 used in the IBM Enterprise System/9000 water-cooled
                 processors. Discussed are a flexible equipment concept
                 applied to the punching, inspection, and testing of the
                 glass-ceramic/copper portion of the substrates, and
                 laser-based equipment for ablation and repair of their
                 polyimide/copper thin-film portion.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Cu/int Cu/el",
  classcodes =   "B0170G (General fabrication techniques); B0170J
                 (Product packaging); B2220C (General fabrication
                 techniques); B0540 (Ceramics and refractories); B0550
                 (Composite materials); B0570 (Glasses); B0560 (Polymers
                 and plastics)",
  classification = "B0170G (General fabrication techniques); B0170J
                 (Product packaging); B0540 (Ceramics and refractories);
                 B0550 (Composite materials); B0560 (Polymers and
                 plastics); B0570 (Glasses); B2220C (General fabrication
                 techniques)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ablation; Ablation; ceramics; composite insulating
                 materials; copper; Cu; flexible equipment; Flexible
                 equipment; glass; glass ceramic/Cu/polyimide substrate
                 fabrication; Glass ceramic/Cu/polyimide substrate
                 fabrication; heat conduction; IBM computers; IBM
                 Enterprise; IBM Enterprise System/9000; inspection;
                 Inspection; integrated circuit; laser-based equipment;
                 Laser-based equipment; manufacture; multichip modules;
                 multilayer; Multilayer substrate; polymers; punching;
                 Punching; repair; Repair; substrate; substrates;
                 System/9000; testing; Testing; thermal conduction
                 modules; Thermal conduction modules; water-cooled
                 processors; Water-cooled processors",
  thesaurus =    "Ceramics; Composite insulating materials; Copper;
                 Glass; Heat conduction; IBM computers; Integrated
                 circuit manufacture; Multichip modules; Polymers;
                 Substrates",
  treatment =    "P Practical",
}

@Article{Brofman:1992:ECT,
  author =       "P. J. Brofman and S. K. Ray and K. F. Beckham",
  title =        "Electrical connections to the thermal conduction
                 modules of the {IBM Enterprise System\slash 9000}
                 water-cooled processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "921--933",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In a complex multichip carrier such as the thermal
                 conduction module (TCM) of IBM high-performance
                 mainframe processors, the interfaces between chips and
                 their substrate as well as between the substrate and
                 its printed circuit board must support a large number
                 of electrical connections. Since chip, substrate, and
                 board typically comprise very different materials, the
                 electrical connections between them must be able to
                 accommodate considerable thermally induced mechanical
                 stress during assembly and use. This paper describes
                 the pin attachment, chip attachment, wire bonding, and
                 laser deletion processes used for forming the
                 electrical connections to the
                 glass-ceramic/copper/polyimide/copper substrate of the
                 thermal conduction modules of the IBM Enterprise
                 System/9000 water-cooled processors.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Cu/int Cu/el",
  classcodes =   "B2240 (Microassembly techniques); B0170J (Product
                 packaging); C5150 (Other circuits for digital
                 computers); C5420 (Mainframes and minicomputers)",
  classification = "B0170J (Product packaging); B2240 (Microassembly
                 techniques); C5150 (Other circuits for digital
                 computers); C5420 (Mainframes and minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "assembly; Assembly; board; bonding; chip attachment;
                 Chip attachment; chip-substrate interfaces;
                 Chip-substrate interfaces; cooling; Cu; electrical
                 connections; Electrical connections; glass
                 ceramic/Cu/polyimide/Cu; Glass ceramic/Cu/polyimide/Cu
                 substrate; heat conduction; high-performance mainframe
                 processors; High-performance mainframe processors; IBM
                 computers; IBM Enterprise; IBM Enterprise System/9000;
                 laser deletion processes; Laser deletion processes;
                 lead bonding; mainframes; multichip carrier; Multichip
                 carrier; multichip modules; pin attachment; Pin
                 attachment; printed circuit; Printed circuit board;
                 stress; substrate; System/9000; thermal conduction
                 module; Thermal conduction module; thermally induced
                 mechanical; Thermally induced mechanical stress;
                 water-cooled processors; Water-cooled processors; wire;
                 Wire bonding",
  thesaurus =    "Cooling; Heat conduction; IBM computers; Lead bonding;
                 Mainframes; Multichip modules",
  treatment =    "P Practical",
}

@Article{Humenik:1992:LDC,
  author =       "J. N. Humenik and J. M. Oberschmidt and L. L. Wu and
                 S. G. Paull",
  title =        "Low-inductance decoupling capacitor for the thermal
                 conduction modules of the {IBM Enterprise System\slash
                 9000} processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "935--942",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Multilayer ceramic decoupling capacitors fabricated
                 using a barium titanate-based dielectric are used with
                 the glass-ceramic/copper/polyimide substrates of the
                 thermal conduction modules (TCMs) of the IBM Enterprise
                 System/9000 processors to suppress the voltage noise
                 generated by the logic circuits of the semiconductor
                 chips used in the processors. Use is made of thick-film
                 multilayer ceramic fabrication processes and thin-film
                 termination processes to achieve substrate-mounted
                 capabilities which, when combined with the
                 low-inductance design of the capacitors, minimize the
                 inductance of the decoupling paths to their adjacent
                 chips. When mounted on the
                 glass-ceramic/copper/polyimide substrate of a
                 water-cooled TCM, the capacitors suppress approximately
                 50\% of the voltage noise, thereby enhancing the
                 performance of the TCMs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "BaTiO3/ss TiO3/ss Ba/ss O3/ss Ti/ss O/ss; Cu/int
                 Cu/el",
  classcodes =   "B2130 (Capacitors); B0170J (Product packaging); B0540
                 (Ceramics and refractories); B2220J (Hybrid integrated
                 circuits); B2220C (General fabrication techniques);
                 C5150 (Other circuits for digital computers); C5420
                 (Mainframes and minicomputers)",
  classification = "B0170J (Product packaging); B0540 (Ceramics and
                 refractories); B2130 (Capacitors); B2220C (General
                 fabrication techniques); B2220J (Hybrid integrated
                 circuits); C5150 (Other circuits for digital
                 computers); C5420 (Mainframes and minicomputers)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "BaTiO$_3$ based dielectric; BaTiO/sub 3/ based;
                 capacitors; ceramics; circuits; conduction; conduction
                 modules; cooling; Cu; decoupling capacitors; Decoupling
                 capacitors; decoupling path; Decoupling path inductance
                 minimization; dielectric; electron device noise;
                 fabrication processes; glass ceramic/Cu/polyimide
                 substrates; Glass ceramic/Cu/polyimide substrates;
                 heat; hybrid integrated circuits; IBM computers; IBM
                 Enterprise; IBM Enterprise System/9000 processors;
                 inductance; inductance design; inductance minimization;
                 integrated circuit manufacture; integrated logic; logic
                 circuits; Logic circuits; low-; Low-inductance design;
                 mainframes; multichip modules; performance;
                 Performance; semiconductor chips; Semiconductor chips;
                 substrates; System/9000 processors; thermal; Thermal
                 conduction modules; thick-film multilayer ceramic;
                 Thick-film multilayer ceramic fabrication processes;
                 thin-film termination processes; Thin-film termination
                 processes; voltage noise; Voltage noise; water cooled
                 module; Water cooled module",
  thesaurus =    "Capacitors; Ceramics; Cooling; Electron device noise;
                 Heat conduction; Hybrid integrated circuits; IBM
                 computers; Inductance; Integrated circuit manufacture;
                 Integrated logic circuits; Mainframes; Multichip
                 modules; Substrates",
  treatment =    "P Practical",
}

@Article{Boone:1992:AED,
  author =       "L. E. Boone and M. R. Brinthaupt and J. A. Malack and
                 J. Pavlik",
  title =        "Aspects of the electrical design and analyses of the
                 printed circuit boards of the {IBM Enterprise
                 System\slash 9000} water-cooled processors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "5",
  pages =        "943--955",
  month =        sep,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Aspects of the electrical design and analyses of the
                 multilayer printed circuit boards of the IBM Enterprise
                 System/9000 water-cooled processors are discussed. The
                 design and analyses pertained to achieving an increase
                 in wirability and a decrease in voltage drops, power
                 loss, simultaneous switching noise, variation in
                 characteristic impedance, and reflections due to the
                 presence of stubs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Endicott, NY, USA",
  classcodes =   "B2210B (Printed circuit layout and design); C5120
                 (Logic and switching circuits); C5420 (Mainframes and
                 minicomputers)",
  classification = "B2210B (Printed circuit layout and design); C5120
                 (Logic and switching circuits); C5420 (Mainframes and
                 minicomputers)",
  corpsource =   "IBM Technol. Products, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "characteristic; Characteristic impedance; electrical
                 analyses; Electrical analyses; electrical design;
                 Electrical design; Enterprise System/9000; IBM; IBM
                 computers; IBM Enterprise System/9000; impedance; loss;
                 mainframes; multilayer printed circuit boards;
                 Multilayer printed circuit boards; power; Power loss;
                 printed circuit design; processors; reflections;
                 Reflections; simultaneous switching noise; Simultaneous
                 switching noise; stubs; Stubs; voltage drops; Voltage
                 drops; water-cooled; Water-cooled processors;
                 wirability; Wirability",
  thesaurus =    "IBM computers; Mainframes; Printed circuit design",
  treatment =    "P Practical",
}

@Article{Nicholson:1992:CEK,
  author =       "C. N. Nicholson",
  title =        "The controlled experiment in knowledge-acquisition
                 research",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "958--964",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A review is given of the literature about controlled
                 experiments in research on knowledge acquisition. The
                 review was carried out to help the author make decision
                 about the design of his own experiment comparing two
                 knowledge-acquisition methods. The author looks
                 critically at six experiments reported in the
                 literature, and proposes a framework within which such
                 empirical work can be viewed. He concludes that some of
                 the apparent difficulties can be resolved, and that
                 controlled experiments can be a useful way of
                 discovering the relationships at work in a
                 knowledge-acquisition project.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM United Kingdom Lab. Ltd., Winchester, UK",
  classcodes =   "C6170 (Expert systems); C0310 (EDP management)",
  classification = "C0310 (EDP management); C6170 (Expert systems)",
  corpsource =   "IBM United Kingdom Lab. Ltd., Winchester, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Controlled experiments; controlled experiments;
                 Empirical work; empirical work; experiments;
                 Experiments; knowledge acquisition; Knowledge
                 acquisition; research and development management",
  thesaurus =    "Knowledge acquisition; Research and development
                 management",
  treatment =    "P Practical",
}

@Article{Bollinger:1992:KO,
  author =       "T. Bollinger and U. Pletat",
  title =        "Knowledge in operation",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "965--989",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The L$_{LILOG}$ knowledge representation language and
                 an inference engine to interpret it have been developed
                 as part of the LILOG project, where new concepts for
                 understanding natural-language texts were investigated.
                 L$_{LILOG}$ is a typed predicate logic whose type
                 system has adopted the concepts of KL-One-like
                 languages. Further language constructs allow the
                 formulation of default and control knowledge. The
                 inference engine for L$_{LILOG}$ was designed as an
                 experimental theorem prover, allowing the authors to
                 investigate the behavior of various inference calculi
                 as well as a number of search strategies. Processing
                 with L$_{LILOG}$ is not restricted to a propositional
                 reasoner for logical formulas; they are also able to
                 delegate special kinds of inferences to external
                 deductive components. Currently, one such external
                 reasoner for processing spatial information on the
                 basis of analog representation is attached to the
                 inference engine.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Germany, GSDL Software Architectures and Technol.,
                 Boeblingen, Germany",
  classcodes =   "C6170 (Expert systems); C6140D (High level languages);
                 C6180N (Natural language processing); C4210 (Formal
                 logic); C6110L (Logic programming)",
  classification = "C4210 (Formal logic); C6110L (Logic programming);
                 C6140D (High level languages); C6170 (Expert systems);
                 C6180N (Natural language processing)",
  corpsource =   "IBM Germany, GSDL Software Architectures and Technol.,
                 Boeblingen, Germany",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analog representation; analog representation; control
                 knowledge; Control knowledge; engine; experimental
                 theorem; Experimental theorem prover; external
                 deductive components; External deductive components;
                 formal logic; inference; Inference calculi; inference
                 calculi; Inference engine; inference mechanisms;
                 KL-One-like languages; knowledge; L$_{LILOG}$ knowledge
                 representation language; L/sub LILOG/ knowledge
                 representation language; language constructs; Language
                 constructs; languages; LILOG project; logic programming
                 languages; Logical formulas; logical formulas; natural;
                 Natural-language texts; natural-language texts;
                 predicate logic; propositional; Propositional reasoner;
                 prover; reasoner; representation; search strategies;
                 Search strategies; spatial information; Spatial
                 information; theorem proving; type system; Type system;
                 typed; Typed predicate logic",
  thesaurus =    "Formal logic; Inference mechanisms; Knowledge
                 representation; Logic programming languages; Natural
                 languages; Theorem proving",
  treatment =    "B Bibliography; P Practical",
}

@Article{Kumar:1992:UDC,
  author =       "M. Kumar",
  title =        "Unique design concepts in {GF11} and their impact on
                 performance",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "990--1000",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "GF11 is a 512-way SIMD parallel computer currently
                 used to verify quantum chromodynamics theory and to
                 explore the SIMD approach to parallel processing.
                 System design choices, such as network design,
                 processing element design, and other architectural
                 features, allow GF11 to sustain very high performance,
                 close to the 10-gigaFLOPS peak. Several applications,
                 such as structural analysis, seismic modeling,
                 computational fluid dynamics, and linear algebra, have
                 been ported to GF11. Applications execute in the range
                 of 4 to 10 gigaFLOPS. The diversity in applications
                 that perform well on GF11 demonstrates that the SIMD
                 architecture is effective for a much larger set of
                 applications than previously believed. The high network
                 and data-memory bandwidths minimize the effort required
                 to tune applications for optimum performance.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C5220P
                 (Parallel architecture); C7320 (Physics and
                 Chemistry)",
  classification = "C5220P (Parallel architecture); C5440
                 (Multiprocessor systems and techniques); C7320 (Physics
                 and Chemistry)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "4 to 10 GFLOPS; 4 To 10 GFLOPS; 512-way SIMD parallel
                 computer; 512-Way SIMD parallel computer; architectural
                 features; Architectural features; computational fluid
                 dynamics; Computational fluid dynamics; data-;
                 Data-memory bandwidths; GF11; linear algebra; Linear
                 algebra; memory bandwidths; modeling; network design;
                 Network design; parallel architectures; parallel
                 machines; parallel processing; Parallel processing;
                 physics computing; processing element design;
                 Processing element design; quantum chromodynamics;
                 Quantum chromodynamics theory; seismic; Seismic
                 modeling; SIMD approach; structural analysis;
                 Structural analysis; theory; very high performance;
                 Very high performance",
  numericalindex = "Computer speed 4.0E+09 to 1.0E+10 FLOPS",
  thesaurus =    "Parallel architectures; Parallel machines; Physics
                 computing",
  treatment =    "P Practical",
}

@Article{Bahr:1992:ADP,
  author =       "J. E. Bahr and S. B. Levenstein and L. A. McMahon and
                 T. J. Mullins and A. H. Wottreng",
  title =        "Architecture, design, and performance of {Application
                 System\slash 400} ({AS}\slash 400) multiprocessors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "1001--1014",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The architecture, design, and performance of
                 multiprocessors in the Application System/400 (AS/400)
                 family are discussed. The authors describe how this
                 multitasking system, originally designed as a
                 uniprocessor system, was modified to form a
                 multiprocessor system. The unique approach, using
                 relatively atomic instructions, required a minimum of
                 change while providing significant performance gains.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Application Business Systems, Rochester, MN, USA",
  classcodes =   "C5440 (Multiprocessor systems and techniques); C6150N
                 (Distributed systems); C5220P (Parallel architecture);
                 C6110P (Parallel programming)",
  classification = "C5220P (Parallel architecture); C5440
                 (Multiprocessor systems and techniques); C6110P
                 (Parallel programming); C6150N (Distributed systems)",
  corpsource =   "IBM Application Business Systems, Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Application System/400; AS/400; multiprocessor system;
                 Multiprocessor system; multitasking system;
                 Multitasking system; parallel; parallel architectures;
                 parallel machines; performance gains; Performance
                 gains; programming; relatively atomic instructions;
                 Relatively atomic instructions",
  thesaurus =    "Parallel architectures; Parallel machines; Parallel
                 programming",
  treatment =    "P Practical; R Product Review",
}

@Article{Anonymous:1992:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "1015--1037",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:01:22 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1992:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "1038--1042",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:02:14 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1992:AIP,
  author =       "Anonymous",
  title =        "Author index for papers in Volume 36",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "1043--1047",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:03:06 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1992:SIP,
  author =       "Anonymous",
  title =        "Subject index for papers in Volume 36",
  journal =      j-IBM-JRD,
  volume =       "36",
  number =       "6",
  pages =        "1048--1052",
  month =        nov,
  year =         "1992",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:03:52 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ono:1993:APE,
  author =       "H. Ono",
  title =        "Architecture and performance of the {ESPER-2}
                 hard-disk drive servo writer",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "1",
  pages =        "3--11",
  month =        jan,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The servo writer is known as the most accurate and
                 sensitive tool on an HDD (hard-disk drive)
                 manufacturing line. ESPER-2 is designed as a
                 product-independent common servo writer which
                 incorporates major advances in equipment cost,
                 reduction of clean-room requirements, and writing
                 accuracy. The servo writing process consists of two
                 stages. The first stage writes the master servo pattern
                 on as many as ten disks at once with little need for
                 contaminant protection facilities. One such master disk
                 is then assembled with other, raw, disks in a file, and
                 the second stage writes the proper servo pattern on all
                 disk surfaces by referring to the master. The effects
                 of off-center discursions in the mechanical disk
                 assembly and random runout (NRRO, or nonrepeatable
                 runout) in the product spindle components are
                 eliminated by table-lookup servo actuator control, so
                 that writing accuracy is improved. Neither an
                 exceptionally clean environment nor fine mechanical
                 parts are required for the second-stage operation.",
  acknowledgement = ack-nhfb,
  affiliation =  "Japan Display Technol. Lab., IBM, Kanagawa, Japan",
  classcodes =   "C5320C (Storage on moving magnetic media); C0300
                 (Management topics)",
  classification = "C0300 (Management topics); C5320C (Storage on moving
                 magnetic media)",
  corpsource =   "Japan Display Technol. Lab., IBM, Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "control; disk assembly; DP industry; ESPER-2; hard
                 discs; hard-disk drive; Hard-disk drive; hard-disk
                 drive servo writer; Hard-disk drive servo writer;
                 manufacturing processes; mechanical; Mechanical disk
                 assembly; off-center discursions; Off-center
                 discursions; random runout; Random runout; servo
                 writing process; Servo writing process; table-lookup
                 servo actuator; Table-lookup servo actuator control;
                 writing accuracy; Writing accuracy",
  thesaurus =    "DP industry; Hard discs; Manufacturing processes",
  treatment =    "P Practical",
}

@Article{Phillips:1993:PCH,
  author =       "J. E. Phillips and S. Vassiliadis",
  title =        "Proof of correctness of high-performance {3-1}
                 interlock collapsing {ALUs}",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "1",
  pages =        "12--21",
  month =        jan,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A 32-bit 3-1 interlock collapsing ALU, proposed to
                 allow the execution of two interlocked ALU-type
                 instructions in one machine cycle using an
                 instruction-level parallel machine implementation, is
                 shown to produce results equivalent to a serial
                 execution of the instructions using a 2-1 ALU. The
                 equivalence is shown by deriving tables which represent
                 all possible requirements for the serial execution of
                 the instructions followed by the generalization of the
                 table to represent sets of instructions rather than the
                 individual instructions themselves. Consequently, the
                 equivalence of the 3-1 interlock collapsing ALU
                 operations with these generalized requirements of the
                 serial execution of the instructions is shown. The
                 correctness of a proposed high-speed interlock
                 collapsing ALU is thereby demonstrated.",
  acknowledgement = ack-nhfb,
  affiliation =  "Adv. Workstation Syst., IBM, Austin, TX, USA",
  classcodes =   "C5220P (Parallel architecture); C5210 (Logic design
                 methods); C4210 (Formal logic)",
  classification = "C4210 (Formal logic); C5210 (Logic design methods);
                 C5220P (Parallel architecture)",
  corpsource =   "Adv. Workstation Syst., IBM, Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3-1 Interlock collapsing ALU; 3-1 interlock collapsing
                 ALU; ALU operations; Correctness; correctness;
                 Equivalence; equivalence; logic design; parallel
                 architectures; parallel machine; Parallel machine",
  thesaurus =    "Logic design; Parallel architectures",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Deutsch:1993:ECP,
  author =       "A. Deutsch and D. W. Dranchak and G. Arjavalingam and
                 C. W. Surovic and J. K. Tam and G. V. Kopcsay and J. B.
                 Gillett",
  title =        "Electrical characterization and performance limits of
                 a flexible cable",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "1",
  pages =        "22--38",
  month =        jan,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The electrical performance of a flexible-cable test
                 structure is characterized from low frequencies up to
                 25 GHz. The experimental results are used to develop
                 and refine models which describe the performance of
                 such cables, with particular emphasis on the
                 contribution of dielectric and resistive losses,
                 including skin effect. The capability of triplate
                 flexible cables to provide high-bandwidth connections
                 over long lengths is investigated with the models
                 developed. A triplate design is chosen because it
                 offers high density, limited crosstalk, no loss through
                 radiation, and relatively inexpensive fabrication. Bit
                 rates of 100 Mb/s-1 Gb/s are considered for propagation
                 over lengths up to 250 cm. The paper highlights the
                 performance-limiting factors through realistic
                 examples, including the contribution of interfaces to
                 other interconnection structures.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Yorktown Heights, NY, USA",
  classcodes =   "B2160 (Wires and cables); B1310 (Waveguides); B2210F
                 (Printed circuit accessories)",
  classification = "B1310 (Waveguides); B2160 (Wires and cables); B2210F
                 (Printed circuit accessories)",
  corpsource =   "Res. Div., IBM Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.1 to 25; 0.1 To 25 GHz; 100 Mbit/s to 1 Gbit/s; 250
                 cm; 250 Cm; attenuation coefficient; Attenuation
                 coefficient; cable testing; crosstalk; Crosstalk;
                 design; dielectric losses; Dielectric losses;
                 electrical performance; Electrical performance;
                 electronic interconnection; Electronic interconnection;
                 flexible cable; Flexible cable; GHz; high-bandwidth
                 connections; High-bandwidth connections; interface
                 contribution; Interface contribution; lines; losses;
                 microstrip; models; Models; performance-limiting
                 factors; Performance-limiting factors; phase constant;
                 Phase constant; printed circuit accessories;
                 propagation length; Propagation length; resistive;
                 Resistive losses; shielded microstrip configuration;
                 Shielded microstrip configuration; skin effect; Skin
                 effect; triplate; Triplate design",
  numericalindex = "Frequency 1.0E+08 to 2.5E+10 Hz; Bit rate 1.0E+08 to
                 1.0E+09 bit/s; Distance 2.5E+00 m",
  thesaurus =    "Cable testing; Crosstalk; Dielectric losses;
                 Microstrip lines; Printed circuit accessories; Skin
                 effect",
  treatment =    "X Experimental",
}

@Article{Horkans:1993:PES,
  author =       "J. Horkans",
  title =        "Preface: Electrochemical Science and Technology",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "83--84",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Deligianni:1993:SSP,
  author =       "H. Deligianni and L. T. Romankiw",
  title =        "In situ surface {pH} measurement during electrolysis
                 using a rotating {pH} electrode",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "85--95",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An in situ technique has been developed for measuring
                 the surface pH adjacent to a solid electrode/liquid
                 interface during electrolysis. Measurements of the
                 surface pH of a solution containing simple salts during
                 hydrogen evolution from a cathode were performed. The
                 surface pH of a cathode during Ni and NiFe
                 electrodeposition was also measured. The experiments
                 demonstrated that, in the absence of buffers or metal
                 ions, the surface pH rises many pH units above the bulk
                 value. During Ni and NiFe electrodeposition, however,
                 the surface pH of solutions consisting of simple salts
                 and starting from a bulk pH level of 2 does not
                 increase more than 3 pH units from the bulk value.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  chemicalindex = "Ni/el; NiFe/bin Fe/bin Ni/bin",
  classcodes =   "A8280F (Electrochemical methods); A8245
                 (Electrochemistry and electrophoresis); A8115L
                 (Deposition from liquid phases (melts and solutions));
                 A8160 (Corrosion, oxidation, etching, and other surface
                 treatments); B0520 (Thin film growth); B7320T (Chemical
                 variables)",
  classification = "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8160 (Corrosion, oxidation, etching, and
                 other surface treatments); A8245 (Electrochemistry and
                 electrophoresis); A8280F (Electrochemical methods);
                 B0520 (Thin film growth); B7320T (Chemical variables)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Dahms-Croll; Dahms-Croll hypothesis; electrode;
                 electrode/liquid interface; Electrode/liquid interface;
                 electrodeposition; Electrodeposition; electrolysis;
                 Electrolysis; hypothesis; in situ technique; In situ
                 technique; localised measurement; Localised
                 measurement; metal-ion hydrolysed; Metal-ion hydrolysed
                 species; Ni deposition; NiFe deposition; pH
                 measurement; rotating pH; Rotating pH electrode;
                 species; surface buffering; Surface buffering; surface
                 chemistry; surface pH measurement; Surface pH
                 measurement; transition metal deposition; Transition
                 metal deposition",
  thesaurus =    "Electrodeposition; PH measurement; Surface chemistry",
  treatment =    "X Experimental",
}

@Article{Horkans:1993:RRS,
  author =       "J. Horkans and I. C. {Hsu Chang} and P. C.
                 Andricacos",
  title =        "A rotating ring-disk stripping technique used to study
                 electroplating of {Sn-Pb} from methane sulfonic acid
                 solutions",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "97--106",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A rotating ring-disk stripping technique has been used
                 to analyze Sn-Pb alloys plated from methane sulfonic
                 acid solutions with and without a proprietary additive
                 and to construct associated current-potential curves.
                 The deposition of both pure Sn and pure Pb was
                 polarized by the additive, but the polarization was
                 much greater for Pb. For alloys plated without the
                 additive, the potential dependence of the partial
                 currents i$_{Sn}$ and i$_{Pb}$ was essentially the same
                 as that of the pure metals. The alloy compositions were
                 very different from the solution ratios Sn(II):Pb(II)
                 and could be either tin-rich or lead-rich compared to
                 the solution. In the presence of the additive, on the
                 other hand, the alloy compositions approximated the
                 solution compositions of the metal ions. The
                 electrodissolution of Sn-Pb alloys in HCl shows a
                 complex oscillatory behaviour, which is produced by the
                 selective dissolution of Sn but which may also be
                 sustained by the formation and redissolution of
                 sparingly soluble surface films.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  chemicalindex = "SnPb/bin Pb/bin Sn/bin",
  classcodes =   "A8280F (Electrochemical methods); A8245
                 (Electrochemistry and electrophoresis); A8160
                 (Corrosion, oxidation, etching, and other surface
                 treatments); A8115L (Deposition from liquid phases
                 (melts and solutions)); B0520 (Thin film growth);
                 B7320T (Chemical variables)",
  classification = "A8115L (Deposition from liquid phases (melts and
                 solutions)); A8160 (Corrosion, oxidation, etching, and
                 other surface treatments); A8245 (Electrochemistry and
                 electrophoresis); A8280F (Electrochemical methods);
                 B0520 (Thin film growth); B7320T (Chemical variables)",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "(chemical analysis); complex oscillatory behaviour;
                 Complex oscillatory behaviour; current-potential
                 curves; Current-potential curves; dissolution;
                 electrodissolution; Electrodissolution; electroplating;
                 Electroplating; lead alloys; methane sulfonic acid
                 solutions; Methane sulfonic acid solutions; partial
                 currents; Partial currents; polarization; Polarization;
                 potential dependence; Potential dependence; ring-disk
                 stripping technique; rotating; Rotating ring-disk
                 stripping technique; selective; Selective dissolution;
                 Sn-Pb; tin alloys; voltammetry",
  thesaurus =    "Electroplating; Lead alloys; Tin alloys; Voltammetry
                 [chemical analysis]",
  treatment =    "X Experimental",
}

@Article{Gaudiello:1993:MIM,
  author =       "J. G. Gaudiello and G. L. Ballard",
  title =        "Mechanistic insights into metal-mediated electroless
                 copper plating employing hypophosphite as a reducing
                 agent",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "107--115",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Electroless copper plating using systems containing a
                 small amount of Ni/sup 2+/ or Pd/sup 2+/ as a mediator
                 and hypophosphite as a reducing agent was investigated
                 using several electrochemical techniques. Isothermal
                 and component-dependent polarization, rate E$_{mix}$,
                 split-cell, and AC impedance data suggested that the
                 systems obey mixed potential theory and function as
                 follows: (a) the mediator is initially deposited from
                 solution to the surface of the workpiece via
                 hypophosphite reduction, (b) oxidation of the
                 hypophosphite at mediator sites supplies charge for Cu
                 reduction, and (c) Cu plating occurs over the entire
                 workpiece, XPS analysis and depth profiling of the
                 resulting deposits suggested that they are homogeneous
                 in nature and that the mediator is uniformly
                 distributed throughout.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Endicott, NY, USA",
  chemicalindex = "Cu/el",
  classcodes =   "B0520 (Thin film growth); B2550F (Metallisation);
                 B0170J (Product packaging)",
  classification = "B0170J (Product packaging); B0520 (Thin film
                 growth); B2550F (Metallisation)",
  corpsource =   "IBM Technol. Products, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AC; AC impedance; component-dependent polarization;
                 Component-dependent polarization; copper; depth; Depth
                 profiling; electrochemical split-cell studies;
                 Electrochemical split-cell studies; electroless Cu
                 plating; Electroless Cu plating; electroless
                 deposition; hypophosphite; Hypophosphite; impedance;
                 interconnects; Interconnects; metal-mediated plating;
                 Metal-mediated plating; metallisation; mixed potential
                 theory; Mixed potential theory; packaging; Packaging;
                 profiling; reducing agent; Reducing agent; voltammetry;
                 Voltammetry; voltammetry (chemical analysis); X-ray
                 photoelectron spectra; XPS analysis",
  thesaurus =    "Copper; Electroless deposition; Metallisation;
                 Packaging; Voltammetry [chemical analysis]; X-ray
                 photoelectron spectra",
  treatment =    "P Practical; X Experimental",
}

@Article{Jagannathan:1993:EPC,
  author =       "R. Jagannathan and M. Krishnan",
  title =        "Electroless plating of copper at a low {pH} level",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "117--123",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A new process for electroless copper plating at a pH
                 level of <or=9 is described. The process uses amine
                 borane reducing agents and ligands based on neutral
                 tetradentate nitrogen donors. The use of a variety of
                 buffer systems is demonstrated. Electroless bath
                 performance over a wide range of conditions is
                 presented. The quality of the plated copper is
                 comparable to that obtained by currently used
                 electroless plating processes, and has a resistivity of
                 about 1.8-2$\mu\Omega$ -cm, depending on bath
                 composition and process parameters. Use of the process
                 is illustrated for forming conductors and filling via
                 holes having submicron minimum dimensions.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  chemicalindex = "Cu/el",
  classcodes =   "B0520 (Thin film growth); B2550F (Metallisation);
                 B0170J (Product packaging)",
  classification = "B0170J (Product packaging); B0520 (Thin film
                 growth); B2550F (Metallisation)",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "amine borane; Amine borane reducing agents; Bath
                 performance; bath performance; buffer systems; Buffer
                 systems; Conductors; conductors; copper; Cu plating;
                 electroless deposition; electroless plating;
                 Electroless plating; filling via; Filling via holes;
                 holes; low pH level; Low pH level; metallisation;
                 Neutral tetradentate nitrogen donors; neutral
                 tetradentate nitrogen donors; packaging; Packaging;
                 packaging; reducing agents; submicron minimum
                 dimensions; Submicron minimum dimensions",
  thesaurus =    "Copper; Electroless deposition; Metallisation;
                 Packaging",
  treatment =    "P Practical; X Experimental",
}

@Article{Dukovic:1993:FSR,
  author =       "J. O. Dukovic",
  title =        "Feature-scale simulation of resist-patterned
                 electrodeposition",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "125--141",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A numerical simulation of resist-patterned or
                 `through-mask' electroplating has been performed to
                 investigate shape evolution at the scale of small
                 lithographic features. Shape evolution and step
                 coverage have a significant influence on the shapes of
                 such microelectronic structures as conductor lines,
                 vias, and magnetic pole pieces. The simulation and
                 associated analysis are based on a model for the rate
                 distribution of the electrodeposition reaction that
                 includes the depletion of the depositing metal ions and
                 the inhibiting action of levelling agents. A stagnant
                 boundary layer is assumed to be present, and the
                 diffusion theory of levelling with a one-parameter
                 description of kinetic inhibition is employed. The
                 results show that when the geometry of a feature cavity
                 makes possible the occurrence of concentration-field
                 effects, an uneven metal-ion flux should cause
                 nonuniform growth at high fractions of the limiting
                 current.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  classcodes =   "B0520 (Thin film growth); B2550F (Metallisation);
                 B2550G (Lithography); B0170J (Product packaging)",
  classification = "B0170J (Product packaging); B0520 (Thin film
                 growth); B2550F (Metallisation); B2550G (Lithography)",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "concentration-field; Concentration-field effects;
                 conductor lines; Conductor lines; description;
                 distribution; effects; electroplating; feature-scale
                 simulation; Feature-scale simulation; kinetic
                 inhibition; Kinetic inhibition; magnetic pole pieces;
                 Magnetic pole pieces; metallisation; model; Model;
                 nonuniform growth; Nonuniform growth; numerical
                 simulation; Numerical simulation; one-parameter;
                 One-parameter description; packaging; rate; Rate
                 distribution; resist-patterned electrodeposition;
                 Resist-patterned electrodeposition; resists;
                 semiconductor process modelling; shape evolution; Shape
                 evolution; small lithographic features; Small
                 lithographic features; stagnant boundary layer;
                 Stagnant boundary layer; step coverage; Step coverage;
                 through-mask electroplating; Through-mask
                 electroplating; uneven metal-ion flux; Uneven metal-ion
                 flux; vias; Vias",
  thesaurus =    "Electroplating; Metallisation; Packaging; Resists;
                 Semiconductor process modelling",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Moreno:1993:MTI,
  author =       "O. A. Moreno and R. H. Katyl and J. D. Jones and P. A.
                 Moschak",
  title =        "Mass transfer of an impinging jet confined between
                 parallel plates (Jet array processing)",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "143--155",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An understanding of the mass transfer behaviour of an
                 impinging jet can be usefully applied to wet chemical
                 processes such as water rinsing, photoresist
                 development, and metal etching or plating. Theoretical
                 and experimental methods were used to study the mass
                 transfer characteristics of an axisymmetric impinging
                 jet confined between two parallel plates. Such a
                 configuration was used because of its potential
                 applicability to the fabrication of printed wiring
                 boards. The CFD (computation fluid dynamics) method was
                 used to model fluid flow and mass transfer. An
                 electrochemical probe based on the ferro-ferricyanide
                 system was used to experimentally determine the mass
                 transfer coefficients and to evaluate the applicability
                 of the theoretical methods used. An etching method was
                 used to characterize the mass transfer rates in a
                 typical cupric chloride etching solution. A new
                 observation of the effect of jet instability on the
                 etching rate in the central impingement zone is
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Endicott, NY, USA",
  classcodes =   "B2210D (Printed circuit manufacture); B0170E
                 (Production facilities and engineering); B0520 (Thin
                 film growth)",
  classification = "B0170E (Production facilities and engineering);
                 B0520 (Thin film growth); B2210D (Printed circuit
                 manufacture)",
  corpsource =   "IBM Technol. Products, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "axisymmetric impinging jet; Axisymmetric impinging
                 jet; boards; central impingement zone; Central
                 impingement zone; computation fluid dynamics;
                 Computation fluid dynamics; effect of jet; Effect of
                 jet instability; electrochemical probe; Electrochemical
                 probe; electroplating; etching; etching method; Etching
                 method; etching rate; Etching rate; fabrication;
                 Fabrication; ferro-ferricyanide system;
                 Ferro-ferricyanide system; instability; jet array
                 processing devices; Jet array processing devices; jets;
                 mass transfer; mass transfer behaviour; Mass transfer
                 behaviour; modelling; parallel plates confined;
                 Parallel plates confined; photoresist development;
                 Photoresist development; photoresists; printed circuit
                 manufacture; printed wiring; Printed wiring boards;
                 rinsing; Rinsing; surface treatment",
  thesaurus =    "Electroplating; Etching; Jets; Mass transfer;
                 Modelling; Photoresists; Printed circuit manufacture;
                 Surface treatment",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Kanazawa:1993:QRE,
  author =       "K. K. Kanazawa and O. R. Melroy",
  title =        "The quartz resonator: Electrochemical applications",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "157--171",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The principles of operation are detailed, with
                 emphasis on an intuitive description to permit
                 considerations of new applications. Mass density
                 changes of the order of 10 nanograms per square
                 centimeter (ng/cm/sup 2/) are routinely detectable as
                 changes in the resonant frequency of about a hertz. The
                 mass density of a monolayer of material ranges from a
                 few tens of ng/cm/sup 2/ for polymeric materials to a
                 few hundreds of ng/cm/sup 2/ for metals. Detailed
                 analysis of the electrical behaviour of the resonator
                 in liquid media shows that the resonant frequency, the
                 quality factor of the resonance, and the admittance at
                 resonance are all sensitive to the viscoelastic
                 properties of the contacting liquid, having
                 implications in the study of the behavior of
                 non-Newtonian fluids, including polymeric films.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., San Jose, CA, USA",
  chemicalindex = "SiO2/sur O2/sur Si/sur O/sur SiO2/bin O2/bin Si/bin
                 O/bin",
  classcodes =   "A0630E (Mass and density measurement); A0130R (Reviews
                 and tutorial papers; resource letters); A8245
                 (Electrochemistry and electrophoresis); B7320M (Mass
                 and density); B2860 (Piezoelectric and ferroelectric
                 devices)",
  classification = "A0130R (Reviews and tutorial papers; A0630E (Mass
                 and density measurement); A8245 (Electrochemistry and
                 electrophoresis); B2860 (Piezoelectric and
                 ferroelectric devices); B7320M (Mass and density);
                 resource letters)",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Admittance at resonance; admittance at resonance;
                 crystal resonators; electrical behaviour; Electrical
                 behaviour; electrochemical; Electrochemical
                 applications; electrochemical applications;
                 Electrochemical interface; electrochemistry; Film
                 deposition monitor; film deposition monitor; interface;
                 liquid media; Liquid media; mass density; Mass density;
                 mass measurement; metals; Metals; microbalance;
                 Microbalance; Monolayer; monolayer; Non-Newtonian
                 fluids; non-Newtonian fluids; polymeric materials;
                 Polymeric materials; properties; quality factor;
                 Quality factor; quartz resonator; Quartz resonator;
                 Resonant frequency; resonant frequency; reviews;
                 SiO$_2$; viscoelastic; Viscoelastic properties",
  thesaurus =    "Crystal resonators; Electrochemistry; Mass
                 measurement; Reviews",
  treatment =    "B Bibliography; G General Review",
}

@Article{Brusic:1993:CPT,
  author =       "V. Brusic and G. S. Frankel and C.-K. Hu and M. M.
                 Plechaty and G. C. Schwartz",
  title =        "Corrosion and protection of thin-line conductors in
                 {VLSI} structures",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "173--189",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Thin metallic lines in VLSI circuit structures are
                 usually encapsulated in a dielectric in order to
                 protect them from the atmosphere and prevent corrosion.
                 However, during processing the lines are unprotected.
                 The authors' work pertains to the loss which is due to
                 corrosion during processing. The focus on the corrosion
                 behavior of the two of the most commonly used
                 conductors, aluminum and copper. Aluminum alloyed with
                 small amounts of copper is also considered. The
                 corrosion-related behaviors of aluminum and copper are
                 vastly different, as is shown by their reaction with
                 water and several processing solutions. The challenge
                 of minimizing corrosion during processing as well as
                 during subsequent storage and use is discussed, using
                 suitable examples drawn from studies of thin films of
                 the metals exposed to chemical etching, reactive ion
                 etching, and cleaning.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  chemicalindex = "Al/sur Al/el; AlCu/sur Al/sur Cu/sur AlCu/ss Al/ss
                 Cu/ss; Cu/sur Cu/el",
  classcodes =   "B2550F (Metallisation); B2570 (Semiconductor
                 integrated circuits)",
  classification = "B2550F (Metallisation); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Al films; Al-Cu; conductors; corrosion; Corrosion;
                 corrosion protection; Cu films; etching effects;
                 Etching effects; Interconnections; interconnections;
                 metallisation; processing; Processing solutions;
                 Protection; protection; solutions; thin-line; Thin-line
                 conductors; VLSI; VLSI structures",
  thesaurus =    "Corrosion; Corrosion protection; Metallisation; VLSI",
  treatment =    "G General Review; P Practical",
}

@Article{Schrott:1993:AXS,
  author =       "A. G. Schrott and G. S. Frankel",
  title =        "Application of {X-ray} spectroscopy to the study of
                 electrochemically formed surface oxide films",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "191--206",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors discuss X-ray photoelectron spectroscopy
                 (XPS) and X-ray absorption spectroscopy (XAS), and
                 their application to the study of electrochemically
                 formed oxide films. A brief review of the phenomena
                 underlying these techniques is provided, along with a
                 description of the commonly used means for implementing
                 them. Their capabilities and limitations are discussed,
                 with an emphasis on the study of passive film
                 composition and oxidation state. A summary of the
                 behavior of Cr in oxide films on Al-Cr alloys is
                 presented as an example. The coordinated use of both
                 XPS and XAS is shown to be useful in achieving full
                 understanding of materials systems such as
                 electrochemically formed oxide films.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  chemicalindex = "AlCr sur Al/sur Cr/sur AlCr/ss Al/ss Cr/ss",
  classcodes =   "A8280D (Electromagnetic radiation spectrometry);
                 A8160B (Metals and alloys); A8280P (Electron
                 spectroscopy for chemical analysis (photoelectron,
                 Auger spectroscopy, etc.)); A7960 (Photoemission and
                 photoelectron spectra); A0785 (X-ray, gamma-ray
                 instruments and techniques)",
  classification = "A0785 (X-ray, gamma-ray instruments and techniques);
                 A7960 (Photoemission and photoelectron spectra); A8160B
                 (Metals and alloys); A8280D (Electromagnetic radiation
                 spectrometry); A8280P (Electron spectroscopy for
                 chemical analysis (photoelectron, Auger spectroscopy,
                 etc.))",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Al-; Al-Cr alloys; chemical analysis; Chemical
                 analysis; Cr alloys; electrochemically formed;
                 Electrochemically formed; films; oxidation; oxidation
                 state; Oxidation state; passivation; passive film
                 composition; Passive film composition; spectroscopy;
                 surface oxide; Surface oxide films; X-ray; X-ray
                 absorption; X-ray absorption spectra; X-ray absorption
                 spectroscopy; X-ray photoelectron spectra; X-ray
                 photoelectron spectroscopy",
  thesaurus =    "Oxidation; Passivation; X-ray absorption spectra;
                 X-ray chemical analysis; X-ray photoelectron spectra;
                 X-ray spectroscopy",
  treatment =    "A Application; G General Review",
}

@Article{Datta:1993:ADM,
  author =       "M. Datta",
  title =        "Anodic dissolution of metals at high rates",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "207--226",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Electrochemical metal shaping and finishing processes
                 involve anodic dissolution of metals at high rates. The
                 author presents a review of some fundamental aspects
                 related to the understanding of such processes.
                 Included are discussions of the phenomena of passive
                 film breakdown that lead to the transpassive
                 dissolution of metals, some of the available
                 information on anodic reaction stoichiometry, and the
                 role of convective mass transport and salt
                 precipitation layers on metal removal rate and surface
                 finish. The use of pulsating current permits the
                 altering of anodic mass transport rates and
                 transpassive dissolution behavior, thereby making it
                 possible to obtain high dissolution efficiencies even
                 at low average current densities.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Yorktown Heights, NY, USA",
  classcodes =   "A8160B (Metals and alloys); A0130R (Reviews and
                 tutorial papers; resource letters); A8245
                 (Electrochemistry and electrophoresis); B8620
                 (Manufacturing industries); B0170G (General fabrication
                 techniques)",
  classification = "A0130R (Reviews and tutorial papers; A8160B (Metals
                 and alloys); A8245 (Electrochemistry and
                 electrophoresis); B0170G (General fabrication
                 techniques); B8620 (Manufacturing industries); resource
                 letters)",
  corpsource =   "IBM Res. Div., Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Anodic dissolution; anodic dissolution; anodic mass;
                 Anodic mass transport rates; anodic reaction
                 stoichiometry; Anodic reaction stoichiometry;
                 convective mass transport; Convective mass transport;
                 dissolving; electrochemical; Electrochemical machining;
                 electrolytic machining; electrolytic polishing;
                 Electropolishing; electropolishing; high rates; High
                 rates; machining; metal; Metal removal rate; metals;
                 Metals; Passive film breakdown; passive film breakdown;
                 pulsating current; Pulsating current; removal rate;
                 reviews; Salt precipitation layers; salt precipitation
                 layers; Surface finish; surface finish; Transpassive
                 dissolution; transpassive dissolution; transport
                 rates",
  thesaurus =    "Dissolving; Electrolytic machining; Electrolytic
                 polishing; Reviews",
  treatment =    "B Bibliography; G General Review",
}

@Article{Seki:1993:SIS,
  author =       "H. Seki",
  title =        "In situ infrared spectroscopy of the
                 electrode-electrolyte interface",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "227--241",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Fourier transform infrared reflection absorption
                 spectroscopy has seen rapid progress and is in wide
                 use. A review of the techniques used in the author's
                 laboratory and examples of recent measurements are
                 presented. The adsorbed species discussed are CO,
                 CN/sup -/, SO$_4$/sup 2-/, and HSO$_4$/sup -/, and the
                 electrodes are, in most cases, polycrystalline noble
                 metals. It is shown how the interpretation of the
                 infrared spectra is greatly aided by comparison with ab
                 initio molecular orbital computations of ions and
                 molecules on metal clusters. Some of the difficulties
                 in the interpretation of the infrared spectra are
                 illustrated, and the future development of optical
                 vibrational spectroscopy for studying
                 electrode-electrolyte interfaces is discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., San Jose, CA, USA",
  chemicalindex = "CO/ads C/ads O/ads CO/bin C/bin O/bin; CN/ads C/ads
                 N/ads CN/bin C/bin N/bin; SO4/ads O4/ads O/ads S/ads
                 SO4/bin O4/bin O/bin S/bin; HSO4/ads SO4/ads O4/ads
                 H/ads O/ads S/ads HSO4/ss SO4/ss O4/ss H/ss O/ss S/ss",
  classcodes =   "A8280D (Electromagnetic radiation spectrometry);
                 A0130R (Reviews and tutorial papers; resource letters);
                 A8245 (Electrochemistry and electrophoresis); A0765G
                 (IR spectroscopy and spectrometers)",
  classification = "A0130R (Reviews and tutorial papers; A0765G (IR
                 spectroscopy and spectrometers); A8245
                 (Electrochemistry and electrophoresis); A8280D
                 (Electromagnetic radiation spectrometry); resource
                 letters)",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ab initio molecular orbital; Ab initio molecular
                 orbital computations; adsorbed species; Adsorbed
                 species; analysis; CN$^-$; CO; computations;
                 electrochemistry; electrode-electrolyte interfaces;
                 Electrode-electrolyte interfaces; Fourier transform
                 infrared; Fourier transform infrared reflection
                 absorption spectroscopy; Fourier transform
                 spectroscopy; HSO$_4^-$; in situ IR spectroscopy; In
                 situ IR spectroscopy; infrared; interface phenomena;
                 metal clusters; Metal clusters; optical vibrational;
                 Optical vibrational spectroscopy; polycrystalline noble
                 metals; Polycrystalline noble metals; reflection
                 absorption spectroscopy; reviews; SO$_4^{2-}$;
                 SO$_^{2-}$; spectrochemical; spectroscopy",
  thesaurus =    "Electrochemistry; Fourier transform spectroscopy;
                 Infrared spectroscopy; Interface phenomena; Reviews;
                 Spectrochemical analysis",
  treatment =    "B Bibliography; G General Review",
}

@Article{White:1993:CMC,
  author =       "J. R. White",
  title =        "Conduction mechanisms in contaminant layers on printed
                 circuit boards",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "243--248",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "AC impedance methods have been utilized to explore
                 surface conduction mechanisms on printed circuit boards
                 (PCBs) containing various types of solder flux
                 contaminants. Residues from water-soluble, rosin-based,
                 and no-clean fluxes were analyzed and evaluated for
                 their potential impact on reliability. Impedance data
                 for intentionally contaminated PCBs having several
                 circuit line geometries were obtained at different
                 relative humidities. An equivalent circuit model is
                 presented that fits the data obtained. It is used to
                 evaluate and distinguish among ohmic, kinetic, and
                 diffusion effects and to predict the environmental
                 conditions that may be detrimental for various line
                 geometries.",
  acknowledgement = ack-nhfb,
  affiliation =  "3M Electron. Products Div., Austin, TX, USA",
  classcodes =   "B2210D (Printed circuit manufacture)",
  classification = "B2210D (Printed circuit manufacture)",
  corpsource =   "3M Electron. Products Div., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AC impedance; AC impedance methods; contaminant
                 layers; Contaminant layers; contaminants; diffusion
                 effects; Diffusion effects; electric impedance;
                 electrochemical parameters; Electrochemical parameters;
                 environmental conditions; Environmental conditions;
                 equivalent circuit model; Equivalent circuit model;
                 equivalent circuits; kinetic effect; Kinetic effect;
                 manufacture; methods; ohmic effects; Ohmic effects;
                 printed circuit; printed circuit boards; Printed
                 circuit boards; reliability; Reliability; solder flux;
                 Solder flux contaminants; soldering; surface conduction
                 mechanisms; Surface conduction mechanisms",
  thesaurus =    "Electric impedance; Equivalent circuits; Printed
                 circuit manufacture; Soldering",
  treatment =    "X Experimental",
}

@Article{Diaz:1993:CCO,
  author =       "A. F. Diaz and J. Guay",
  title =        "Contact charging of organic materials: Ion vs.
                 electron transfer",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "2",
  pages =        "249--259",
  month =        mar,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The authors describe some of the recent literature on
                 the contact charging (tribocharging and contact
                 electrification) of organic materials. It has been
                 proposed that the charging is due to the transfer of
                 electrons and/or ions. In some studies, the correlation
                 between the charging and the substituent constants for
                 a substituted series of compounds has been used to
                 support the electron transfer mechanism, and it has
                 been proposed that the correlation reflects systematic
                 changes in the energy levels of the highest and lowest
                 occupied molecular orbitals of the derivatives. In
                 others, the detection of the ions that are transferred
                 during contact and the correspondence between their
                 sign and that of the transferred charge have been used
                 to support the ion transfer mechanism. The authors
                 discuss a selected number of papers that relate the
                 charging behavior to electrochemistry and discuss the
                 results reported in light of the two transfer
                 mechanisms.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., San Jose, CA, USA",
  classcodes =   "A7340B (Static electrification); A0130R (Reviews and
                 tutorial papers; resource letters); A8245
                 (Electrochemistry and electrophoresis); A4110D
                 (Electrostatics, magnetostatics)B5110
                 (Electrostatics)",
  classification = "A0130R (Reviews and tutorial papers; A4110D
                 (Electrostatics, magnetostatics); A7340B (Static
                 electrification); A8245 (Electrochemistry and
                 electrophoresis); B5110 (Electrostatics); resource
                 letters)",
  corpsource =   "IBM Res. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "contact charging; Contact charging; contact
                 electrification; Contact electrification;
                 electrification; electrochemistry; Electrochemistry;
                 electron transfer; Electron transfer; ion transfer; Ion
                 transfer; organic compounds; organic materials; Organic
                 materials; reviews; static; transfer mechanisms;
                 Transfer mechanisms; tribocharging; Tribocharging",
  thesaurus =    "Electrochemistry; Organic compounds; Reviews; Static
                 electrification",
  treatment =    "B Bibliography; G General Review",
}

@Article{Warlaumont:1993:PXR,
  author =       "John M. Warlaumont",
  title =        "Preface: {X}-Ray Lithography",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "288--289",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Spiller:1993:EHX,
  author =       "E. Spiller",
  title =        "Early history of {X}-ray lithography at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "291--297",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The author presents a reconstruction of the early work
                 on X-ray lithography at the IBM East Fishkill facility
                 in 1969 and 1970 and a summary of the efforts at the
                 Thomas J. Watson Research Center in Yorktown Heights,
                 New York, between 1973 and 1976.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1969; 1970; 1973 to 1976; 1973 To 1976; early history;
                 Early history; history; IBM; Thomas J. Watson Research
                 Center; X-ray lithography",
  thesaurus =    "History; X-ray lithography",
  treatment =    "G General Review",
}

@Article{Wilson:1993:XLI,
  author =       "Alan D. Wilson",
  title =        "{X-ray} lithography in {IBM}, {1980--1992}, the
                 development years",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "299--318",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM X-ray lithography research and development
                 program is outlined, from a personal perspective,
                 covering the period from the inception of the program
                 in 1980 through the development of IBM's own storage
                 ring for X-ray production in 1992. The following
                 aspects, among others, are discussed: origins of the
                 program; acquisition of an X-ray port at Brookhaven
                 National Laboratory; masks for X-ray lithography;
                 development of special tooling for X-ray lithography,
                 including a wafer stepper, a precision e-beam X-ray
                 mask writing system, and a superconducting (dipole)
                 electron synchrotron installed in the IBM Advanced
                 Lithography Facility (ALF) in East Fishkill, New York.
                 Key device programs were conducted to increase
                 understanding of the X-ray lithography process and
                 confirm its utility.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "B2550G (Lithography); B7410D (Particle sources and
                 targets); B7450 (X-ray and gamma-ray equipment); B2570
                 (Semiconductor integrated circuits)",
  classification = "B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits); B7410D (Particle sources and
                 targets); B7450 (X-ray and gamma-ray equipment)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1980 To 1992; 1980 to 1992; electron accelerators;
                 IBM; lithography; Masks; masks; Precision e-beam X-ray
                 mask writing system; precision e-beam X-ray mask
                 writing system; Storage ring; storage ring; storage
                 rings; superconducting electron synchrotron;
                 Superconducting electron synchrotron; synchrotrons;
                 wafer stepper; Wafer stepper; X-ray; X-ray lithography;
                 X-ray production",
  thesaurus =    "Electron accelerators; Storage rings; Synchrotrons;
                 X-ray lithography; X-ray production",
  treatment =    "G General Review; P Practical",
}

@Article{Smith:1993:XLN,
  author =       "Henry I. Smith and M. L. Schattenburg",
  title =        "{X-ray} lithography, from 500 to 30 nm: {X-ray}
                 nanolithography",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "319--329",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Proximity X-ray lithography (XRL), using wavelengths
                 between 0.8 and 1.5 nm, provides a near-ideal match to
                 the `system problem' of lithography for feature sizes
                 from 500 to 30 nm, by virtue of `absorption without
                 scattering' and recently developed mask technology. The
                 effects of photoelectrons, at one time through to be
                 problematic, are now understood not to limit
                 resolution. With experiments and simulations via
                 Maxwell's equations, the author shows that useful
                 resolution is not limited by diffraction until
                 linewidths are below 50 nm. It is critically important
                 to optimize the source spatial incoherence to eliminate
                 the deleterious effects of high spatial frequencies.
                 Mask architecture and patterning methods are presented
                 which he believes are compatible with manufacturing at
                 linewidths from 500 to 30 nm. Distortion due to mask
                 frame flexing and absorber stress can now be
                 eliminated. Elimination of distortion at the pattern
                 generation stage remains the problem of greatest
                 concern. He discusses a proposed method of
                 spatial-phase-locked electron-beam lithography which
                 could solve this problem. The new interferometric
                 alignment scheme has achieved 18-nm alignment at 3
                 sigma. He asserts that projection XRL using multilayer
                 mirrors at 13 nm can never match the present
                 performance of proximity XRL. Applications of
                 sub-100-nm XRL, including MOS, quantum-effect, and
                 optoelectronic devices are discussed which illustrate
                 the benefits of high resolution, process robustness,
                 low distortion, low damage, and high throughput.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. Eng. and Comput. Sci., MIT,
                 Cambridge, MA, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "Dept. of Electr. Eng. and Comput. Sci., MIT,
                 Cambridge, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "30; 30 To 500 nm; distortion; Distortion; effect
                 devices; electron beam lithography; Feature sizes;
                 feature sizes; interferometric alignment scheme;
                 Interferometric alignment scheme; mask architecture;
                 Mask architecture; mask frame flexing; Mask frame
                 flexing; Mask patterning; mask patterning; Maxwell
                 equations; Maxwell's equations; MOS devices;
                 nanolithography; nanotechnology; optoelectronic
                 devices; Optoelectronic devices; Proximity X-ray
                 lithography; proximity X-ray lithography; quantum;
                 Quantum effect devices; Resolution; resolution;
                 spatial-phase-locked electron-beam lithography;
                 Spatial-phase-locked electron-beam lithography; to 500
                 nm; X-ray; X-ray lithography; X-ray nanolithography",
  numericalindex = "Size 3.0E-08 to 5.0E-07 m",
  thesaurus =    "Electron beam lithography; Maxwell equations;
                 Nanotechnology; X-ray lithography",
  treatment =    "P Practical; X Experimental",
}

@Article{Guo:1993:MXP,
  author =       "Jerry Z. Y. Guo and F. Cerrina",
  title =        "Modeling {X-ray} proximity lithography",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "331--349",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Advanced semiconductor circuits, such as DRAMs, are
                 based on the very complex fabrication processes.
                 Because of the cost and complexity involved, it is
                 rapidly becoming impossible to adopt a
                 `trial-and-error' approach in the development stage of
                 a new process. Fortunately, the advances in computer
                 power spurred by the new semiconductor devices have
                 made it possible to compute the response of complex
                 systems in a reasonable time on workstations. Thus, the
                 study of a virtual representation of the process (that
                 is, a model) can represent a solution to the high cost
                 of process development-of course, after verification of
                 the model accuracy through controlled experiments. A
                 correct physical interpretation of the process under
                 study is necessary in order to implement a model that
                 is both accurate and extendible. This is particularly
                 true for new approaches, such as those involved in
                 X-ray lithography. The authors have studied the process
                 of image formation in X-ray lithography and have
                 implemented several models to predict the intensity
                 distribution at the wafer plane. The models can be
                 applied to the definition of an optimal exposure system
                 that will provide the maximum exposure latitude, and to
                 the study of new types of X-ray masks.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Electr. and Comput. Eng., Wisconsin Univ.,
                 Madison, WI, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "Dept. of Electr. and Comput. Eng., Wisconsin Univ.,
                 Madison, WI, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Image formation; image formation; Intensity
                 distribution; intensity distribution; masks; Model;
                 model; Optimal exposure system; optimal exposure
                 system; semiconductor process modelling; X-ray
                 lithography; X-ray masks; X-ray proximity lithography",
  thesaurus =    "Masks; Semiconductor process modelling; X-ray
                 lithography",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Wilson:1993:HCS,
  author =       "M. N. Wilson and A. I. C. Smith and V. C. Kempson and
                 M. C. Townsend and J. C. Schouten and R. J. Anderson
                 and A. R. Jorden and V. P. Suller and M. W. Poole",
  title =        "The {Helios} 1 compact superconducting storage ring
                 {X-ray} source",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "351--371",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The basic properties of synchrotron radiation are
                 described, the design of storage rings to produce
                 synchrotron radiation is outlined, and the criteria for
                 matching storage ring design to the needs of X-ray
                 lithography are discussed. Simple scaling laws are
                 presented showing the benefits for a storage ring of
                 using the higher fields which superconducting magnets
                 are able to provide. Helios 1 is a compact
                 superconducting storage ring built by Oxford
                 Instruments for installation at the IBM Advanced
                 Lithography Facility (ALF). Design choices for
                 superconducting rings are discussed, and the design and
                 construction of Helios are described. Tests results
                 from the initial commissioning of Helios at Oxford are
                 presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "Accel. Technol. Group, Oxford Instrum. Ltd., UK",
  classcodes =   "A2920D (Storage rings); A2925 (Particle sources and
                 targets, preparation and technology); A2920L
                 (Synchrotrons); B7410D (Particle sources and targets);
                 B2550G (Lithography); B7450 (X-ray and gamma-ray
                 equipment)",
  classification = "A2920D (Storage rings); A2920L (Synchrotrons); A2925
                 (Particle sources and targets, preparation and
                 technology); B2550G (Lithography); B7410D (Particle
                 sources and targets); B7450 (X-ray and gamma-ray
                 equipment)",
  corpsource =   "Accel. Technol. Group, Oxford Instrum. Ltd., UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "construction; Construction; design; Design; electron
                 accelerators; Helios 1; lithography; ring; storage
                 rings; superconducting storage; Superconducting storage
                 ring; synchrotron radiation; Synchrotron radiation;
                 synchrotrons; X-ray; X-ray production",
  thesaurus =    "Electron accelerators; Storage rings; Synchrotrons;
                 X-ray lithography; X-ray production",
  treatment =    "P Practical",
}

@Article{Archie:1993:PIS,
  author =       "Chas Archie",
  title =        "Performance of the {IBM} synchrotron {X-ray} source
                 for lithography",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "373--384",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The compact superconducting synchrotron X-ray source
                 at the IBM Advanced Lithography Facility in East
                 Fishkill, New York has been in service to customers
                 since the start of 1992. Its availability during
                 scheduled time is greater than 90\%, with recent months
                 frequently surpassing 95\%. Data on the long-term
                 behavior of the X-ray source properties and subsystem
                 performance are now available. The full system
                 continues to meet all specifications and even to
                 surpass them in key areas. Measured electron beam
                 properties such as beam size, short- and long-term
                 positional stability, and beam lifetime are presented.
                 Lifetimes greater than 20 hours for typical stored
                 beams have significantly simplified operations and
                 increased availability compared to projections. This
                 paper also describes some unique features of this X-ray
                 source and goes beyond a discussion of downtime to
                 describe the efforts behind the scenes to maintain and
                 operate it.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "A2925F (Beam handling, focusing, pulsing, stripping
                 and diagnostics); A2920D (Storage rings); A2920L
                 (Synchrotrons); B7410B (Beam handling and diagnostics);
                 B7410D (Particle sources and targets); B7450 (X-ray and
                 gamma-ray equipment); B2550G (Lithography)",
  classification = "A2920D (Storage rings); A2920L (Synchrotrons);
                 A2925F (Beam handling, focusing, pulsing, stripping and
                 diagnostics); B2550G (Lithography); B7410B (Beam
                 handling and diagnostics); B7410D (Particle sources and
                 targets); B7450 (X-ray and gamma-ray equipment)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "beam; Beam lifetime; beam properties; beam size; Beam
                 size; compact superconducting synchrotron; Compact
                 superconducting synchrotron; electron; electron
                 accelerators; Electron beam properties; Helios-1; IBM
                 Advanced Lithography Facility; lifetime; lithography;
                 Lithography; particle beam diagnostics; Positional
                 stability; positional stability; rings; storage;
                 synchrotrons; X-ray lithography; X-ray production;
                 X-ray source",
  thesaurus =    "Electron accelerators; Particle beam diagnostics;
                 Storage rings; Synchrotrons; X-ray lithography; X-ray
                 production",
  treatment =    "P Practical; X Experimental",
}

@Article{Leavey:1993:DCI,
  author =       "J. A. Leavey and L. G. Lesoine",
  title =        "Design considerations for the {IBM X-ray} lithography
                 facility",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "385--393",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Synchrotrons, like other large particle accelerators,
                 have historically been the tools of universities and
                 national laboratories for research. Moving this
                 technology to industry presents many challenges which
                 do not exist in an academic environment. One major
                 challenge is to develop a facility to house and support
                 the ring in a manufacturing-like mode where operator,
                 customer, and public concerns for radiation and
                 industrial safety is of extreme importance. This paper
                 describes IBM's efforts to design and build a facility
                 to address these safety concerns.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Hopewell Junction, NY, USA",
  classcodes =   "A2920L (Synchrotrons); B7410D (Particle sources and
                 targets); B2550G (Lithography); B7450 (X-ray and
                 gamma-ray equipment)",
  classification = "A2920L (Synchrotrons); B2550G (Lithography); B7410D
                 (Particle sources and targets); B7450 (X-ray and
                 gamma-ray equipment)",
  corpsource =   "IBM Federal Syst. Co., Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "design; Design; facility; IBM X-ray lithography; IBM
                 X-ray lithography facility; industrial safety;
                 Industrial safety; lithography; radiation protection;
                 radiation safety; Radiation safety; safety;
                 synchrotrons; Synchrotrons; X-ray; X-ray production",
  thesaurus =    "Radiation protection; Safety; Synchrotrons; X-ray
                 lithography; X-ray production",
  treatment =    "P Practical; X Experimental",
}

@Article{Silverman:1993:XLB,
  author =       "J. P. Silverman and R. P. Rippstein and J. M.
                 Oberschmidt",
  title =        "{X-ray} lithography beamlines in the {IBM Advanced
                 Lithography Facility}",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "395--410",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In 1991 a storage ring designed as a source of X-rays
                 for X-ray lithography was delivered, installed, and
                 commissioned in the IBM Advanced Lithography Facility
                 (ALF) in East Fishkill, New York. Beamlines of two
                 different designs have been constructed and installed
                 on the ring to deliver the X-rays to the exposure
                 stations. One design is intended for use with a stepper
                 for the fabrication of integrated circuits. The second
                 design is for a general-purpose research and
                 development beamline which is used for unaligned
                 exposures as well as for characterization of beamline
                 components. The design and performance of both are
                 described. Special attention is given to a paraboloid
                 mirror optical system which is used to collimate the
                 radiation from the storage ring. Both the theoretical
                 and the measured performance of the mirror are
                 presented and shown to be in excellent agreement. An
                 exposure nonuniformity of less than +or-3\%, including
                 contributions from both the mirror and the beryllium
                 exist window, has been achieved.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Semicond. Res. and Dev. Center, Thomas J. Watson
                 Res. Center, Yorktown Heights, NY, USA",
  classcodes =   "A0777 (Particle beam production and handling;
                 targets); A4278D (Optical system design); A0785 (X-ray,
                 gamma-ray instruments and techniques); A4278C (Lens and
                 mirror design); B7410B (Beam handling and diagnostics);
                 B2550G (Lithography); B7450 (X-ray and gamma-ray
                 equipment)",
  classification = "A0777 (Particle beam production and handling; A0785
                 (X-ray, gamma-ray instruments and techniques); A4278C
                 (Lens and mirror design); A4278D (Optical system
                 design); B2550G (Lithography); B7410B (Beam handling
                 and diagnostics); B7450 (X-ray and gamma-ray
                 equipment); targets)",
  corpsource =   "IBM Semicond. Res. and Dev. Center, Thomas J. Watson
                 Res. Center, Yorktown Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "beam handling equipment; design; Design; exposure
                 nonuniformity; Exposure nonuniformity; IBM Advanced;
                 IBM Advanced Lithography Facility; Lithography
                 Facility; mirrors; optics; paraboloid mirror optical;
                 Paraboloid mirror optical system; storage ring; Storage
                 ring; system; X-ray; X-ray lithography; X-ray
                 lithography beamlines",
  thesaurus =    "Beam handling equipment; Mirrors; X-ray lithography;
                 X-ray optics",
  treatment =    "P Practical; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Groves:1993:EBL,
  author =       "T. R. Groves and J. G. Hartley and H. C. Pfeiffer and
                 D. Puisto and D. K. Bailey",
  title =        "Electron beam lithography tool for manufacture of
                 {X-ray} masks",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "411--419",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "An electron beam lithography system suitable for
                 manufacturing X-ray masks with critical dimensions down
                 to 0.35$\mu$m is described. The system features a 50-kV
                 variable shaped spot electron volume with a variable
                 axis immersion lens. This column is capable of
                 maintaining 0.035-$\mu$m edge acuity of the focused
                 spot over a 2.1-mm deflection field. These fields are
                 stitched together over an 84*84-mm active pattern area
                 via motion of an xy table. The table position is
                 measured using a laser interferometer. The measurement
                 data are fed back to the magnetic deflection to correct
                 small errors. Maintaining positional accuracy of the
                 beam relative to the writing surface relies on a
                 strategy of measuring and correcting repeatable errors.
                 This is described in detail. Pattern placement accuracy
                 is 0.070$\mu$m (3 sigma) and image size control is
                 0.025$\mu$m (3 sigma), achieved over the entire
                 84*84-mm pattern area. This performance is achieved
                 with yield better than 90\%, as confirmed by routine
                 measurements. The system is currently used to
                 manufacture product X-ray masks with 0.35-$\mu$m
                 critical dimensions. Typical measurement results on
                 product masks are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Technol. Products, Hopewell Junction, NY, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); B0170E (Production facilities and
                 engineering); C3355Z (Other manufacturing processes);
                 C3120C (Spatial variables); C7410H (Instrumentation)",
  classification = "B0170E (Production facilities and engineering);
                 B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits); C3120C (Spatial variables); C3355Z (Other
                 manufacturing processes); C7410H (Instrumentation)",
  corpsource =   "IBM Technol. Products, Hopewell Junction, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.025 micron; 0.025 Micron; 0.07 micron; 0.07 Micron;
                 0.35 micron; 0.35 Micron; 50 kV; 50 KV; beam; Beam;
                 computerised instrumentation; electron beam
                 lithography; electron beam lithography system; Electron
                 beam lithography system; electron volume; image size
                 control; Image size control; integrated circuit
                 manufacture; manufacture; Manufacture; masks; pattern
                 placement accuracy; Pattern placement accuracy;
                 position control; positional accuracy; Positional
                 accuracy; ray lithography; variable axis immersion
                 lens; Variable axis immersion lens; variable shaped
                 spot; Variable shaped spot electron volume; X-; X-ray
                 masks; xy table; Xy table",
  numericalindex = "Size 3.5E-07 m; Distance 7.0E-08 m; Voltage 5.0E+04
                 V; Distance 2.5E-08 m",
  thesaurus =    "Computerised instrumentation; Electron beam
                 lithography; Integrated circuit manufacture; Masks;
                 Position control; X-ray lithography",
  treatment =    "P Practical; X Experimental",
}

@Article{Blauner:1993:XMR,
  author =       "P. G. Blauner and J. Mauer",
  title =        "{X}-ray mask repair",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "421--434",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A method for repairing X-ray lithographic masks using
                 focused ion beam technology is described and
                 demonstrated. The ion beam is used for mask imaging,
                 for absorber milling for opaque repair, and for
                 deposition of X-ray-opaque material for clear repair.
                 Solutions to the unique problems faced in executing
                 these tasks on the high-resolution, high-aspect-ratio
                 patterns characteristic of X-ray masks are discussed.
                 Several effects of material redeposition during opaque
                 repair are explored. The significance of this same
                 redeposition during clear repair and the resulting
                 advantage gained in using a high-yield deposition
                 process are illustrated. Examples of repairs and
                 printed images of these repairs are shown for feature
                 sizes smaller than 0.25$\mu$m.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B2550G (Lithography); B2570 (Semiconductor integrated
                 circuits)",
  classification = "B2550G (Lithography); B2570 (Semiconductor
                 integrated circuits)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.25 micron; 0.25 Micron; absorber; Absorber milling;
                 deposition process; feature sizes; Feature sizes;
                 focused ion beam technology; Focused ion beam
                 technology; high-yield; High-yield deposition process;
                 ion beam applications; mask imaging; Mask imaging;
                 masks; material redeposition; Material redeposition;
                 milling; opaque material deposition; Opaque material
                 deposition; opaque repair; Opaque repair; ray
                 lithography; repairing; Repairing; X-; X-ray
                 lithographic; X-ray lithographic masks",
  numericalindex = "Size 2.5E-07 m",
  thesaurus =    "Focused ion beam technology; Ion beam applications;
                 Masks; X-ray lithography",
  treatment =    "P Practical; X Experimental",
}

@Article{Seeger:1993:RMP,
  author =       "David Seeger",
  title =        "Resist materials and processes for {X-ray}
                 lithography",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "3",
  pages =        "435--448",
  month =        may,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A key component that is sometimes overlooked in X-ray
                 lithography is the resist material. The lithographic
                 properties of these materials are extremely important
                 if one is to take advantage of the superior
                 lithographic performance often observed in X-ray
                 lithography. The properties of such materials may even
                 be more important than in conventional optical
                 lithography, since the feature sizes delineated by this
                 lithographic technique are much smaller. A description
                 of X-ray resists is presented which discusses both the
                 chemistry and the lithographic properties of these
                 materials. The characterization and stability of these
                 processes are highlighted.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson, Yorktown Heights, NY,
                 USA",
  classcodes =   "B2550G (Lithography)",
  classification = "B2550G (Lithography)",
  corpsource =   "IBM Res. Div., Thomas J. Watson, Yorktown Heights, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Chemistry; chemistry; feature sizes; Feature sizes;
                 photoresists; radiation chemistry; Resist material;
                 resist material; resists; X-ray; X-ray lithography;
                 X-ray resists",
  thesaurus =    "Photoresists; Radiation chemistry; X-ray lithography",
  treatment =    "P Practical; X Experimental",
}

@Article{Fazzio:1993:HAD,
  author =       "D. P. Fazzio and M. A. Moser and C. J. Polson and J.
                 N. Scheffel",
  title =        "Head actuator dynamics of an {IBM} $5 1/4$-inch disk
                 drive",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "479--490",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "The IBM 5 1/4 -inch disk drive contained in the IBM
                 9345 DASD Module provides high track density and
                 storage capacity, dynamic test failure rates below
                 three parts per million, and low sensitivity to
                 assembly variations. The design techniques used to
                 achieve the required vibrational characteristics of the
                 head actuator assembly are described. Dynamic stability
                 specifications are derived from drive performance
                 requirements and the actuator servomechanical system
                 design. Modeshapes of the actuator are determined by
                 encoding magnetic patterns onto a disk and using the
                 read/write heads as position transducers in an
                 operational drive. Structural changes in the carriage
                 assembly that might lead to design improvements are
                 explored with models derived using finite element
                 analysis. Taguchi orthogonal matrix experiments are
                 used to reduce the sensitivity of the actuator to
                 dimensional tolerances and assembly processes. The
                 achievement of actuator assembly design objectives is
                 verified from production yields and statistical data
                 obtained during dynamic tests.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Adstar, San Jose, CA, USA",
  classcodes =   "B3120B (Magnetic recording); C5320C (Storage on moving
                 magnetic media); C3260 (Actuating and final control
                 devices)",
  classification = "B3120B (Magnetic recording); C3260 (Actuating and
                 final control devices); C5320C (Storage on moving
                 magnetic media)",
  corpsource =   "IBM Adstar, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "actuator servomechanical system; Actuator
                 servomechanical system design; actuators; analysis;
                 assembly variation; Assembly variation; carriage
                 assembly; Carriage assembly; characteristics; DASD
                 Module; design; dimensional tolerances; Dimensional
                 tolerances; dynamic stability specifications; Dynamic
                 stability specifications; dynamic test; Dynamic test
                 failure rates; dynamic tests; Dynamic tests; failure
                 rates; finite element; finite element analysis; Finite
                 element analysis; head actuator dynamics; Head actuator
                 dynamics; IBM 5 1/4 -inch disk drive; IBM 9345; IBM
                 9345 DASD Module; magnetic disc storage; modeshapes;
                 Modeshapes; performance requirements; Performance
                 requirements; sensitivity; Sensitivity; stability;
                 storage capacity; Storage capacity; Taguchi orthogonal
                 matrix; track density; Track density; vibrational;
                 Vibrational characteristics",
  thesaurus =    "Actuators; Finite element analysis; Magnetic disc
                 storage; Stability",
  treatment =    "P Practical",
}

@Article{Osborn:1993:SMM,
  author =       "B. E. Osborn",
  title =        "Statistical modeling in manufacturing: Adapting a
                 diagnostic tool to real-time applications",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "491--506",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper describes a process for constructing a
                 statistical model to automate the analysis of data from
                 complex diagnostic tools. The method is demonstrated on
                 data taken from an optical emission spectrometer (OES),
                 one of the most powerful tools used in semiconductor
                 manufacturing for detecting the chemical composition
                 and impurity levels in plasma processes. The analysis
                 of OES data currently requires hours of manual effort
                 by an expert spectroscopist, rendering it ineffective
                 for real-time monitoring and control. However, through
                 the use of statistical modeling, the analysis can be
                 performed automatically on a personal computer in a
                 matter of seconds. The process of model construction is
                 examined in general, and methods are developed for
                 demonstrating how information from an expert can be
                 combined with information from the data in order to
                 provide a statistical basis for analysis. The
                 effectiveness of the model is demonstrated on data from
                 typical plasma processes.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  classcodes =   "B7210B (Automatic test and measurement systems);
                 B0170E (Production facilities and engineering); C7410D
                 (Electronic engineering); C7410H (Instrumentation);
                 C7420 (Control engineering); C3355 (Manufacturing
                 processes)",
  classification = "B0170E (Production facilities and engineering);
                 B7210B (Automatic test and measurement systems); C3355
                 (Manufacturing processes); C7410D (Electronic
                 engineering); C7410H (Instrumentation); C7420 (Control
                 engineering)",
  corpsource =   "IBM Enterprise Syst., Poughkeepsie, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; chemical; Chemical composition; complex
                 diagnostic tools; Complex diagnostic tools;
                 composition; computerised monitoring; diagnostic tool;
                 Diagnostic tool; electronic engineering computing;
                 impurity levels; Impurity levels; optical emission;
                 Optical emission spectrometer; plasma processes; Plasma
                 processes; process computer control; real-time;
                 Real-time applications; semiconductor device
                 manufacture; semiconductor manufacturing; Semiconductor
                 manufacturing; spectrometer; statistical modeling;
                 Statistical modeling",
  thesaurus =    "Computerised monitoring; Electronic engineering
                 computing; Process computer control; Semiconductor
                 device manufacture",
  treatment =    "A Application; P Practical",
}

@Article{Tibbitts:1993:FSC,
  author =       "B. R. Tibbitts",
  title =        "Flexible simulation of a complex semiconductor
                 manufacturing line using a rule-based system",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "507--521",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Rule-based systems have been used to produce fast,
                 flexible simulation models for semiconductor
                 manufacturing lines. This paper describes such a
                 rule-based simulator for a semiconductor manufacturing
                 line, and the language in which it is written. The
                 simulator is written in a rule-based declarative style
                 that uses a single-rule `template' to move thousands of
                 product tots through various process steps; the rule is
                 customized as needed with data for each step, route,
                 lot, tool, manpower skill, etc. Since line or product
                 changes require only reading new data from a database,
                 without reprogramming, this provides a modeling
                 environment that is simple, flexible, and maintainable.
                 The model is implemented in ECLPS (enhanced common Lisp
                 production system), also known as a knowledge-based or
                 expert systems language. It handles very large models
                 (thousands of data elements, or more) well and is very
                 fast.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Programming Syst., Lexington, KY, USA",
  classcodes =   "C7480 (Production engineering); C6170 (Expert
                 systems); C7410D (Electronic engineering)",
  classification = "C6170 (Expert systems); C7410D (Electronic
                 engineering); C7480 (Production engineering)",
  corpsource =   "IBM Programming Syst., Lexington, KY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "complex semiconductor manufacturing; Complex
                 semiconductor manufacturing line; ECLPS; electronic
                 engineering computing; enhanced common Lisp production;
                 Enhanced common Lisp production system; expert systems;
                 expert systems language; Expert systems language;
                 flexible; flexible simulation; Flexible simulation;
                 line; LISP; manufacture; manufacturing systems;
                 modeling environment; Modeling environment; rule-based
                 declarative style; Rule-based declarative style;
                 rule-based system; Rule-based system; semiconductor
                 device; system",
  thesaurus =    "Electronic engineering computing; Expert systems;
                 Flexible manufacturing systems; LISP; Semiconductor
                 device manufacture",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Grotzinger:1993:CPA,
  author =       "S. J. Grotzinger and R. Srinivasan and R. Akella and
                 S. Bollapragada",
  title =        "Component procurement and allocation for products
                 assembled to forecast: Risk-pooling effects",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "523--536",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "This paper considers procurement and allocation
                 policies in a manufacturing environment where common
                 components are assembled into various products that
                 have stochastic demands. The components are allocated
                 to the assembly of a product at a time when product
                 demand is still uncertain (assemble to forecast, ATF).
                 The special case of one component shared by N different
                 products is analyzed, and insights into the general
                 problem are obtained for the situation in which the
                 common component can be reallocated to different
                 products as product demands change. An allocation
                 policy is developed for general distributions and
                 prices in an ATF environment. The policy first
                 addresses anomalies in the state of the system and
                 then, for a feasible state, minimizes the expected
                 excess finished-goods inventory. A procurement level
                 that is nearly optimal is obtained from a Monte Carlo
                 simulation in which the probability of satisfying all
                 of the random product demands simultaneously is
                 considered relative to this allocation policy.
                 Numerical studies indicate that the total component and
                 finished-goods inventory is significantly reduced by an
                 allocation policy that incorporates risk pooling while
                 still fulfilling service-level requirements.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C7480 (Production engineering); C3355F (Assembling);
                 C1140G (Monte Carlo methods)",
  classification = "C1140G (Monte Carlo methods); C3355F (Assembling);
                 C7480 (Production engineering)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "allocation; Allocation policies; assemble to forecast;
                 Assemble to forecast; assembling; component
                 procurement; Component procurement; flexible
                 manufacturing systems; manufacturing environment;
                 Manufacturing environment; methods; Monte Carlo; Monte
                 Carlo simulation; policies; risk-pooling effects;
                 Risk-pooling effects",
  thesaurus =    "Assembling; Flexible manufacturing systems; Monte
                 Carlo methods",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Irvin:1993:MCD,
  author =       "D. R. Irvin",
  title =        "Modeling the cost of data communication for multi-node
                 computer networks operating in the {United States}",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "537--546",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Examines the cost of data communication for multi-node
                 computer networks operating in the United States. The
                 author begins by defining a market basket of
                 private-line transmission services and identifying its
                 constituent prices. Two analytic models are then
                 proposed. The first, which derives a theoretical
                 relationship from microeconomic considerations, gives
                 price movement as a function of the demand for service.
                 The second embodies a learning curve fit to historical
                 data, wherein the slope of this curve (0.71) equals the
                 slope of the historical curve tor the advance of
                 integrated-circuit technology. Extrapolations from the
                 two models agree well; moreover, both extrapolations
                 conform to long-established historical trends. These
                 agreements lend plausibility to the idea that the price
                 of data communication unfolds in an orderly way over
                 the long run, and, despite the perturbation introduced
                 by the Bell System divestiture of 1984, future price
                 movements may return to their traditional 11\% annual
                 decline.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Networking Syst., Research Triangle Park, NC,
                 USA",
  classcodes =   "C0310 (EDP management); C0230 (Economic, social and
                 political aspects); C5620 (Computer networks and
                 techniques)",
  classification = "C0230 (Economic, social and political aspects);
                 C0310 (EDP management); C5620 (Computer networks and
                 techniques)",
  corpsource =   "IBM Networking Syst., Research Triangle Park, NC,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer networks; cost; Cost; data communication;
                 Data communication; economics; learning curve; Learning
                 curve; management; market basket; Market basket;
                 microeconomic considerations; Microeconomic
                 considerations; multi-node computer networks;
                 Multi-node computer networks; price movement; Price
                 movement; private-line transmission; Private-line
                 transmission services; services; telecommunication
                 network; United States",
  thesaurus =    "Computer networks; Economics; Telecommunication
                 network management",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Eickemeyer:1993:LIU,
  author =       "R. J. Eickemeyer and S. Vassiliadis",
  title =        "A load instruction unit for pipelined processors",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "547--564",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A special-purpose load unit is proposed as part of a
                 processor design. The unit prefetches data from the
                 cache by predicting the address of the data fetch in
                 advance. This prefetch allows the cache access to take
                 place early, in an otherwise unused cache cycle,
                 eliminating one cycle from the load instruction. The
                 prediction also allows the cache to prefetch data if
                 they are not already in the cache. The cache-miss
                 handling can be overlapped with other instruction
                 execution. It is shown, using trace-driven simulations,
                 that the proposed mechanism, when incorporated in a
                 design, may contribute to a significant increase in
                 processor performance. The paper also compares
                 different prediction methods and describes a hardware
                 implementation for the load unit.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Application Bus. Syst., Rochester, MN, USA",
  classcodes =   "C5220P (Parallel architecture); C6120 (File
                 organisation); C5470 (Performance evaluation and
                 testing)",
  classification = "C5220P (Parallel architecture); C5470 (Performance
                 evaluation and testing); C6120 (File organisation)",
  corpsource =   "IBM Application Bus. Syst., Rochester, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "buffer storage; cache access; Cache access;
                 cache-miss; Cache-miss handling; handling; hardware
                 implementation; Hardware implementation; load
                 instruction unit; Load instruction unit; load unit;
                 performance evaluation; pipeline processing; pipelined
                 processors; Pipelined processors; prediction methods;
                 Prediction methods; processor design; Processor design;
                 special-purpose; Special-purpose load unit; storage
                 management; trace-driven simulations; Trace-driven
                 simulations",
  thesaurus =    "Buffer storage; Performance evaluation; Pipeline
                 processing; Storage management",
  treatment =    "P Practical",
}

@Article{Anonymous:1993:RPI,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "565--578",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:20:15 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1993:RIP,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "4",
  pages =        "579--580",
  month =        jul,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 13 07:20:19 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lim:1993:PSB,
  author =       "C. K. Lim and T. Caulfield and J. A. Benenati",
  title =        "Preface: Solder Ball Connect Technology",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "582--583",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Corbin:1993:FEA,
  author =       "J. S. Corbin",
  title =        "Finite element analysis for {Solder Ball Connect}
                 ({SBC}) structural design optimization",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "585--596",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Solder ball connect (SBC) is a second-level surface
                 mount electronics packaging technology in which ceramic
                 modules containing one or more chips are joined to a
                 circuit card (FR-4) by means of an array of
                 nonhomogeneous solder columns. These columns consist of
                 a high-temperature-melting 90\%Pb/10\%Sn solder sphere
                 attached to the module and card with eutectic solder
                 fillets. The solder structures accommodate the bulk of
                 the strain (which is due to the thermal-expansion
                 mismatch between FR-4 and the 9211 ceramic of the
                 modules) generated during power cycling. If the solder
                 structures are not properly designed, the thermal
                 strain can be a source of premature fatigue failure. In
                 this work, finite element analysis is used to
                 characterize the plastic strains that develop in the
                 SBC interconnection during thermal cycling. Since
                 plastic strain is a dominant parameter that influences
                 low-cycle fatigue, it is used as a basis of comparison
                 for various structural alternatives. Designed
                 experiment techniques are used to systematically
                 evaluate the thermal strain sensitivity to structural
                 variables. Results are used to identify an optimally
                 reliable structure that is robust in terms of
                 assembly-process variables.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
                 USA",
  chemicalindex = "PbSn/bin Pb/bin Sn/bin",
  classcodes =   "B2210D (Printed circuit manufacture); B0170J (Product
                 packaging); B0290T (Finite element analysis)",
  classification = "B0170J (Product packaging); B0290T (Finite element
                 analysis); B2210D (Printed circuit manufacture)",
  corpsource =   "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "assembling; Ceramic modules; ceramic modules; Circuit
                 card; circuit card; columns; Eutectic solder fillets;
                 eutectic solder fillets; failure; FEA; FEM; finite
                 element analysis; Finite element analysis; finite
                 element analysis; FR-4; high temperature melting solder
                 sphere; High temperature melting solder sphere;
                 interconnection; level SMT packaging technology;
                 Low-cycle fatigue; low-cycle fatigue; mismatch; MLC
                 module attachment; nonhomogeneous solder;
                 Nonhomogeneous solder columns; Pb-Sn; PCB assembly
                 solder column array; plastic deformation; plastic
                 strains; Plastic strains; Power cycling; power cycling;
                 premature fatigue; Premature fatigue failure; printed
                 circuit manufacture; SBC; SBC interconnection; second-;
                 Second-level SMT packaging technology; Solder ball
                 connect; solder ball connect; soldering; Structural
                 design optimization; structural design optimization;
                 surface mount; Surface mount electronics; surface mount
                 electronics; technology; Thermal cycling; thermal
                 cycling; thermal strain; Thermal strain; thermal stress
                 cracking; thermal-expansion; Thermal-expansion
                 mismatch",
  thesaurus =    "Assembling; Finite element analysis; Plastic
                 deformation; Printed circuit manufacture; Soldering;
                 Surface mount technology; Thermal stress cracking",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Ries:1993:ASB,
  author =       "M. D. Ries and D. R. Banks and D. P. Watson and K. G.
                 Hoebener",
  title =        "Attachment of {Solder Ball Connect} ({SBC}) packages
                 to circuit cards",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "597--608",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "IBM has developed an assembly process to attach a new
                 family of solder ball connect (SBC) integrated circuit
                 packages to glass/epoxy cards using surface mount
                 technology (SMT). The process provides nearly perfect
                 yields for the resulting solder ball joint structures
                 and ensures reliability by controlling wear-out due to
                 metallurgical fatigue. The package, card, and process
                 parameters found to most strongly influence the
                 assembly yield and reliability are summarized, and
                 unique test hardware and analysis techniques are
                 discussed. Process considerations, analytical
                 techniques, and test methods described for SBC packages
                 should apply to other ball grid array (BGA) packages.",
  acknowledgement = ack-nhfb,
  affiliation =  "Hewlett Packand Co., Fort Collins, CO, USA",
  classcodes =   "B2210D (Printed circuit manufacture); B0170J (Product
                 packaging); B0170N (Reliability)",
  classification = "B0170J (Product packaging); B0170N (Reliability);
                 B2210D (Printed circuit manufacture)",
  corpsource =   "Hewlett Packand Co., Fort Collins, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "assembling; Assembling; assembly process; Assembly
                 process; assembly yield; Assembly yield; ball grid
                 array; Ball grid array; Ball grid array, BGA packages;
                 BGA packages; circuit cards; Circuit cards; circuit
                 reliability; Circuit reliability; glass/epoxy cards;
                 Glass/epoxy cards; IBM; integrated circuit; Integrated
                 circuit packages; manufacture; packages; printed
                 circuit; Printed circuit manufacture; printed circuit
                 testing; Printed circuit testing; reliability;
                 Reliability; SBC packages; SMD; SMT; solder ball
                 connect; Solder ball connect; surface mount; surface
                 mount technology; Surface mount technology; technology;
                 test hardware; Test hardware",
  thesaurus =    "Assembling; Circuit reliability; Printed circuit
                 manufacture; Printed circuit testing; Surface mount
                 technology",
  treatment =    "P Practical; X Experimental",
}

@Article{Mahaney:1993:TMI,
  author =       "H. V. Mahaney",
  title =        "Thermal modeling of the infrared reflow process for
                 {Solder Ball Connect} ({SBC})",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "609--619",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "A thermal model of the infrared reflow process has
                 been developed for an FR-4 card populated with an array
                 of solder ball connect (SBC) modules. The analysis of
                 the three-dimensional, transient, finite element model
                 accounts for radiative exchange within the infrared
                 oven and for the heat conduction (nonisotropic) within
                 the modules and card. Transient temperature profiles of
                 selected points and three-dimensional temperature
                 distributions at selected times are presented to
                 describe the primary heat-transport mechanisms.
                 Numerical predictions and empirical data indicate that
                 the SBC modules are relatively isothermal throughout
                 the infrared reflow process. Therefore, every solder
                 ball within the array exhibits a nearly identical
                 thermal profile. This result is fortunate, since the
                 inner solder ball connections cannot be visually
                 inspected. The influence of module spacing and the
                 ability to improve the reflow process by use of a
                 high-emissivity cap coating are demonstrated.",
  acknowledgement = ack-nhfb,
  affiliation =  "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
                 USA",
  classcodes =   "B2210D (Printed circuit manufacture); B0170J (Product
                 packaging); B0290T (Finite element analysis)",
  classification = "B0170J (Product packaging); B0290T (Finite element
                 analysis); B2210D (Printed circuit manufacture)",
  corpsource =   "Div. of Adv. Workstations and Syst., IBM, Austin, TX,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D transient FEM model; assembling; cap coating;
                 circuit manufacture; connect; dimensional temperature
                 distributions; finite element analysis; finite element
                 model; Finite element model; FR-4 card; heat
                 conduction; Heat conduction; heat-transport;
                 Heat-transport mechanisms; high-emissivity;
                 High-emissivity cap coating; infrared oven; Infrared
                 oven; infrared reflow process; Infrared reflow process;
                 IR-reflow method; mechanisms; modelling; printed;
                 radiative exchange; Radiative exchange; SBC modules;
                 solder ball; Solder ball connect; soldering; surface
                 mount technology; temperature distribution; temperature
                 profiles; thermal analysis; thermal model; Thermal
                 model; thermal profile; Thermal profile; three-;
                 Three-dimensional temperature distributions; transient;
                 Transient temperature profiles",
  thesaurus =    "Assembling; Finite element analysis; Modelling;
                 Printed circuit manufacture; Soldering; Surface mount
                 technology; Temperature distribution; Thermal
                 analysis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Wu:1993:TSC,
  author =       "T. Y. Wu and Y. Guo and W. T. Chen",
  title =        "Thermal-mechanical strain characterization for printed
                 wiring boards",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "621--634",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Multilayer printed wiring boards are widely used in
                 electronic packaging assemblies. One critical
                 reliability concern is the thermal-mechanical strains
                 induced by temperature change. For example, the
                 in-plane strain affects the thermal fatigue life of
                 surface mount solder interconnections, while the
                 out-of-plane strain affects the mechanical integrity of
                 the plated-through holes of the printed wiring boards.
                 For this paper, a systematic study of the
                 thermal-mechanical strain of epoxy-glass printed wiring
                 boards, below and above the glass transition
                 temperatures of the epoxies, has been carried out. The
                 study includes measurements of properties of basic
                 constituent materials (epoxy, glass fabric, copper), of
                 intermediate building blocks in the fabrication
                 process, and of final products. The study has led to a
                 quantitative engineering model that predict the average
                 in-plane thermal-mechanical strain for use in modeling
                 surface mount components on a printed wiring board, as
                 well as the average out-of-plane thermal-mechanical
                 strain for determining plated-through-hole reliability
                 in thermal shock processes. The reliability of surface
                 mount solder interconnections and plated-through holes
                 is discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectronics Div., IBM, Endicott, NY, USA",
  chemicalindex = "Cu/int Cu/el",
  classcodes =   "B2210 (Printed circuits); B0170N (Reliability); B0550
                 (Composite materials)",
  classification = "B0170N (Reliability); B0550 (Composite materials);
                 B2210 (Printed circuits)",
  corpsource =   "Microelectronics Div., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit reliability; circuits; Cu; deformation;
                 electronic; Electronic packaging assemblies;
                 engineering; Engineering model; epoxy-glass laminate;
                 Epoxy-glass laminate; fabrication process; Fabrication
                 process; glass fabric; Glass fabric; glass transition;
                 Glass transition temperatures; in-plane strain;
                 In-plane strain; laminates; mechanical integrity;
                 Mechanical integrity; model; multilayer PWB; Multilayer
                 PWB; out-of-plane strain; Out-of-plane strain;
                 packaging assemblies; plated-through holes;
                 Plated-through holes; printed; printed wiring boards;
                 Printed wiring boards; PTH reliability; strain
                 characterization; Strain characterization; stress
                 cracking; surface mount components; Surface mount
                 components; surface mount solder interconnections;
                 Surface mount solder interconnections; surface mount
                 technology; temperature change; Temperature change;
                 temperatures; thermal; thermal fatigue life; Thermal
                 fatigue life; thermal shock; thermal shock processes;
                 Thermal shock processes; thermal-mechanical strains;
                 Thermal-mechanical strains",
  thesaurus =    "Circuit reliability; Deformation; Laminates; Printed
                 circuits; Surface mount technology; Thermal shock;
                 Thermal stress cracking",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Guo:1993:SBC,
  author =       "Y. Guo and C. K. Lim and W. T. Chen and C. G.
                 Woychik",
  title =        "Solder ball connect ({SBC}) assemblies under thermal
                 loading. {I}. Deformation measurement via Moir{\'{e}}
                 interferometry, and its interpretation",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "635--647",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "Thermal deformations that result from mismatches of
                 coefficients of thermal expansion (CTE) in solder ball
                 connect (SBC) assemblies were investigated. The CTE
                 mismatches of the materials and the components in the
                 package have both macro and micro effects on the strain
                 distributions in the SBC interconnections. The geometry
                 of the SBC joint also has a strong influence on the
                 solder strains in the SBC package. An experimental
                 technique with high sensitivity and resolution, moire
                 interferometry, was used to obtain whole-field
                 displacements. Thermal strains in SBC packages,
                 especially the strain concentrations in the SBC joints,
                 were then determined from the displacement fields. The
                 experimental results played an important role in
                 failure analysis, structural design optimization, and
                 finite element model verification in the IBM SBC
                 program. The results also show that Moire
                 interferometry is a very powerful and effective tool in
                 experimental studies of electronic packaging.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectronics Div., IBM, Endicott, NY, USA",
  classcodes =   "B0170J (Product packaging); B7320C (Spatial
                 variables); B2210 (Printed circuits)",
  classification = "B0170J (Product packaging); B2210 (Printed
                 circuits); B7320C (Spatial variables)",
  corpsource =   "Microelectronics Div., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuits; coefficients of thermal; Coefficients of
                 thermal expansion; concentrations; CTE; CTE mismatches;
                 deformation; distributions; electronic packaging;
                 Electronic packaging; Electronic packaging,
                 Deformation; expansion; failure analysis; Failure
                 analysis; FEM model verification; finite element model;
                 Finite element model; IBM SBC program; light
                 interferometry; Light interferometry; loading; moire
                 fringes; moire interferometry; Moire interferometry;
                 Moir{\'{e}} fringes; Moir{\'{e}} interferometry; mount
                 technology; optimization; printed; Printed circuits;
                 SBC interconnections; SBC joint; SBC package; SMD
                 assemblies; SMT; solder; solder ball connect; Solder
                 ball connect; Solder strains; soldering; Soldering;
                 spatial variables measurement; Spatial variables
                 measurement; strain; Strain concentrations; Strain
                 distributions; strains; structural design; Structural
                 design optimization; surface; Surface mount technology;
                 thermal; thermal expansion; Thermal expansion; Thermal
                 loading; whole-field displacements; Whole-field
                 displacements",
  thesaurus =    "Deformation; Light interferometry; Moire fringes;
                 Printed circuits; Soldering; Spatial variables
                 measurement; Surface mount technology; Thermal
                 expansion",
  treatment =    "X Experimental",
}

@Article{Choi:1993:SBC,
  author =       "H.-C. Choi and Y. Guo and W. LaFontaine and C. K.
                 Lim",
  title =        "{Solder Ball Connect} ({SBC}) assemblies under thermal
                 loading: {II}. Strain analysis via image processing,
                 and reliability considerations",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "5",
  pages =        "649--659",
  month =        sep,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "For pt.I see ibid., vol.37, no.5, p.649-59 (1993). A
                 novel approach to processing interferometric moire
                 images, called computational Fourier transform moire,
                 has been developed. The essential principle of this
                 technique is to automatically calculate a whole-field
                 strain from digitized images of interferometric moire
                 fringes using digital Fourier transform procedures.
                 With the use of this technique, a whole-field strain
                 distribution of a solder ball connect (SBC)
                 interconnection under thermal loading was obtained. The
                 calculated strain field was then used to understand
                 fatigue modes of SBC observed from an accelerated
                 thermal cycling (ATC) test.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectronics Div., IBM, Endicott, NY, USA",
  classcodes =   "B0170J (Product packaging); B2210 (Printed circuits);
                 B0170N (Reliability); B7320G (Force, torque and work);
                 B6140C (Optical information and image processing);
                 B0230 (Integral transforms)",
  classification = "B0170J (Product packaging); B0170N (Reliability);
                 B0230 (Integral transforms); B2210 (Printed circuits);
                 B6140C (Optical information and image processing);
                 B7320G (Force, torque and work)",
  corpsource =   "Microelectronics Div., IBM, Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "accelerated thermal cycling; Accelerated thermal
                 cycling; circuit reliability; computational Fourier
                 transform moire; Computational Fourier transform moire;
                 deformation; digital Fourier transform procedures;
                 Digital Fourier transform procedures; digitized images;
                 Digitized images; distribution; fatigue; Fatigue modes;
                 Fourier; fringes; image; image processing; Image
                 processing; interferometric moire images;
                 Interferometric moire images; light interferometry;
                 modes; moire; printed circuits; processing;
                 reliability; Reliability; SBC assemblies; SBC
                 interconnection; solder ball connect; Solder ball
                 connect; soldering; strain field; Strain field; strain
                 measurement; surface mount technology; thermal loading;
                 Thermal loading; thermal stress cracking; transforms;
                 whole-field strain; Whole-field strain distribution",
  thesaurus =    "Circuit reliability; Deformation; Fatigue; Fourier
                 transforms; Image processing; Light interferometry;
                 Moire fringes; Printed circuits; Soldering; Strain
                 measurement; Surface mount technology; Thermal stress
                 cracking",
  treatment =    "P Practical; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Hauge:1993:P,
  author =       "P. S. Hauge",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "678--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:20 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#one",
  abstract =     "Thirty-seven years ago, Thomas J. Watson, Jr.,
                 introduced the first issue of the IBM Journal of
                 Research and Development with the following message:
                 The new IBM Journal of Research and Development is a
                 strong indication of the increasing emphasis we at IBM
                 want to place in the future on fundamental science and
                 technology. In the IBM Journal, our scientists and
                 engineers will describe their latest and most
                 significant new ideas and concepts, as well as new and
                 improved products. I hope and believe that the IBM
                 corporation will make real contributions to the
                 expanding perimeters of knowledge in the physical
                 sciences and mathematics, as well as in the more
                 specialized areas of data processing, computer
                 technology, and communications. The prompt publication
                 of new scientific and technological advances is, I
                 believe, of real benefit to the individual and to the
                 company. I also feel that it is desirable to share such
                 knowledge with others throughout the world as soon as
                 is reasonably possible. New scientific knowledge is,
                 without doubt, one of the greatest sources of hope for
                 man in our time. It can never remain the exclusive
                 secret of any group or nation for any considerable
                 period. I am convinced that, through a more widespread
                 and rapid publication of any additions we may make to
                 this store of knowledge, we at IBM can contribute
                 significantly to a freer exchange of ideas and
                 knowledge among all men. Since its creation in 1957,
                 the IBM Journal of Research and Development has
                 reflected the company's technical emphasis by
                 publishing 2190 papers and communications and by
                 listing more than 20000 US patents issued to IBM and
                 more than 30000 papers published by IBM authors in
                 other technical journals. This issue is a
                 thirty-seven-year Cumulative Index covering the 203
                 issues of the Journal published to date. The Index
                 consists of four parts: authors, topics, subjects, and
                 abstracts. Author Index Entries in the Author Index are
                 arranged alphabetically by the last name of the first
                 author. Primary entries contain the author names, the
                 title of the paper, the volume and issue number in
                 boldface, the beginning page number, and the year of
                 publication. If a paper has more than one author,
                 secondary entries appear for the additional authors.
                 These entries refer to the primary entry and omit the
                 other authors and the title. Topic Index The Topic
                 Index identifies those journal issues which are devoted
                 in whole or in part to a particular topic. Papers
                 belonging to these topics are listed in order of
                 publication. Listings include the title of the paper,
                 the last name of the first author, and the beginning
                 page number. Headings include the volume and issue
                 number and the year of publication. When a particular
                 issue contains more than one topic, the volume, issue
                 number, and year appear in the heading for the first
                 topic only. Subject-Code Listing The Subject Index was
                 formed by merging and editing the annual subject
                 indexes. Because of year-to-year variations in subject
                 headings, related papers do not always appear under the
                 same heading in the merged index. To aid in
                 cross-referencing the entries, each heading in the
                 merged index is assigned a four-character code. For
                 example, Scanning tunneling microscopy is SC01. All the
                 subject codes associated with a paper are given with
                 that paper each time it appears in any of the 400
                 subject listings. To aid in locating papers in the
                 Subject Index, an alphabetical listing of the codes and
                 subjects is provided. Subject Index Entries in the
                 Subject Index include the title of the paper, the last
                 name of the first author, the volume and issue number
                 (boldface), beginning page number, year of publication,
                 and the codes of all other subjects pertaining to that
                 paper. Abstracts The Abstracts section lists papers
                 chronologically by volume, issue, and year, in the
                 order in which they appear in the table of contents of
                 each issue. Individual entries show the title
                 (boldface), authors, and beginning page number of each
                 paper, followed by the abstract. For completeness,
                 material which does not contain an abstract, such as a
                 preface or a short communication, is noted by an entry
                 which contains the title, author and beginning page
                 number. \par

                 Peter S. Hauge Editor",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:CII,
  author =       "Anonymous",
  title =        "Cumulative index. {IBM J. Res. Dev., vols. 1--37
                 (1957--1993)}",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "679--1214",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#auth",
  ZMnumber =     "785.00006",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:AI,
  author =       "Anonymous",
  title =        "Author Index",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "679--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#auth",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:TI,
  author =       "Anonymous",
  title =        "Topic Index",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "745--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#topic",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:SC,
  author =       "Anonymous",
  title =        "Subject Codes",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "767--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#subcode",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:SI,
  author =       "Anonymous",
  title =        "Subject Index",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "773--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#subj",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1993:A,
  author =       "Anonymous",
  title =        "Abstracts",
  journal =      j-IBM-JRD,
  volume =       "37",
  number =       "6",
  pages =        "901--??",
  month =        nov,
  year =         "1993",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jan 3 14:24:13 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd37-6.html#abst",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Vertes:1994:MTT,
  author =       "A. Vertes and R. W. Dreyfus and D. E. Platt",
  title =        "Modeling the thermal-to-plasma transitions for {Cu}
                 photoablation",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "3--10",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html#one",
  abstract =     "Excimer laser ablation of metals starts as a thermal
                 process in the approximately 1 J/cm/sup 2/ fluence
                 range and makes a rapid transition near 5 J/cm/sup 2/
                 to a highly ionized plume (for 10 ns pulses). The 1-5
                 J/cm/sup 2/ range is of particular interest because it
                 overlaps the irradiance range used to fabricate
                 high-temperature superconductors, diamond-like carbon
                 films, and conducting Cu films. Covered in this paper
                 are analyses aimed at a quantitative evaluation of the
                 transition using a previously described model. The
                 model is based primarily on the thermal (diffusivity
                 and vapor pressure) properties of copper, along with
                 electron heating by inverse bremsstrahlung due to
                 electrons scattering off both neutrals and ions. The
                 analyses provide a good fit and insight into previously
                 obtained laser-induced fluorescence results for Cu/sup
                 0/, Cu/sup +/, and Cu$_2$. Also, the surface shadowing
                 and plasma heating beginning in the 5 J/cm/sup 2/ (500
                 MW/cm/sup 2/) region are clearly illustrated.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Chem., George Washington Univ., Washington,
                 DC, USA",
  chemicalindex = "Cu/el",
  classcodes =   "A7920D (Laser-light impact phenomena); A6180B
                 (Ultraviolet, visible and infrared radiation); A8115H
                 (Chemical vapour deposition); A6855 (Thin film growth,
                 structure, and epitaxy)B0520F (Vapour deposition);
                 B0530 (Metals and alloys)",
  classification = "A6180B (Ultraviolet, visible and infrared
                 radiation); A6855 (Thin film growth, structure, and
                 epitaxy); A7920D (Laser-light impact phenomena); A8115H
                 (Chemical vapour deposition); B0520F (Vapour
                 deposition); B0530 (Metals and alloys)",
  corpsource =   "Dept. of Chem., George Washington Univ., Washington,
                 DC, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "10 ns; 10 Ns; bremsstrahlung; conducting Cu films;
                 Conducting Cu films; conductivity of solids; copper;
                 Cu; Cu photoablation; Cu$_2$; Cu/sup +/; Cu/sup 0/;
                 diamond-like C films; Diamond-like C films;
                 diffusivity; Diffusivity; electron heating; Electron
                 heating; electron scattering; Electron scattering;
                 excimer; Excimer laser ablation; fluence; Fluence;
                 fluorescence; inverse; Inverse bremsstrahlung; ionized
                 plume; Ionized plume; irradiance range; Irradiance
                 range; laser ablation; laser-induced; Laser-induced
                 fluorescence; plasma heating; Plasma heating; pulsed
                 laser deposition; shadowing; surface; Surface
                 shadowing; thermal; thermal diffusivity; thermal
                 process; Thermal process; thermal-to-plasma
                 transitions; Thermal-to-plasma transitions; vapor
                 pressure; Vapor pressure; vapour pressure",
  numericalindex = "Time 1.0E-08 s",
  thesaurus =    "Bremsstrahlung; Copper; Pulsed laser deposition;
                 Thermal conductivity of solids; Thermal diffusivity;
                 Vapour pressure",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Kurtzberg:1994:ABC,
  author =       "Jerome M. Kurtzberg and Menachem Levanoni",
  title =        "{ABC}: a better control for manufacturing",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "11--30",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html#two",
  abstract =     "ABC is a generic methodology to improve the quality of
                 manufacturing. It can optimize operation of a single
                 process or an entire factory to meet or exceed product
                 specifications. ABC is based on three nets which
                 continually interact to model processes and to provide
                 local process control and global product optimization.
                 Significant process variables are identified,
                 evaluated, and ranked according to their contributions
                 to product quality. Process performance, which
                 determines product quality, is characterized by a
                 sensitive parameter, the Q-factor, which is used for
                 local control and for global optimization. Real-time
                 response maps capture process behavior and identify
                 current status, improved operating points, and expected
                 improvement in relation to design targets. ABC
                 continually compensates for off-specification
                 manufacturing steps by feedforward-and-feedback
                 corrective actions which keep the product on target.
                 ABC also evaluates and ranks the effects of non-numeric
                 manufacturing variables, such as specific tools and
                 vendors, on product quality. Total quality control can
                 be achieved by optimizing all variables, both
                 sensor-based and non-numeric, which control the
                 product. Some of ABC's capabilities are demonstrated in
                 a multistep fabrication of a semiconductor capacitor in
                 which the electrical properties of the product are
                 optimized by controlling the individual chemical
                 process steps. ABC's capacity to minimize scrap and
                 rework by compensating for out-of-control conditions is
                 demonstrated in this example. A functional subset of
                 ABC currently exists as a menu-driven tool, implemented
                 in APL2 on VM/CMS for mainframe computers and in the C
                 language for workstation platforms: RS\slash 6000
                 running under AIX and PS/2 under OS/2. ABC is
                 available, in the workstation version, as an IBM
                 Program Offering under the name QuMAP super(TM)-A
                 Better Control, and is currently used in the
                 semiconductor, pharmaceutical, chemical, and consumer
                 goods industries.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C7480 (Production engineering); C7420 (Control
                 engineering)",
  classification = "C7420 (Control engineering); C7480 (Production
                 engineering)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ABC; AlX; APL2; C language; generic methodology;
                 Generic methodology; global optimization; Global
                 optimization; global product optimization; Global
                 product optimization; manufacturing computer control;
                 menu-driven; Menu-driven tool; OS/2; performance;
                 process; Process performance; product; Product
                 specifications; PS/2; Q-factor; quality control;
                 quality of manufacturing; Quality of manufacturing;
                 QuMAP-A; RS/6000; specifications; tool; VM/CMS",
  thesaurus =    "Manufacturing computer control; Quality control",
  treatment =    "G General Review; P Practical",
}

@Article{Ho:1994:EHH,
  author =       "C.-T. Ho and S. L. Johnsson",
  title =        "Embedding hyperpyramids into hypercubes",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "31--45",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html#three",
  ZMnumber =     "819.68010",
  abstract =     "A P(k,d) hyperpyramid is a level structure of k
                 hypercubes, where the hypercube at level i is of
                 dimension id, and a node at level i-1 is connected to
                 every node in a d-dimensional subcube at level i,
                 except for the leaf level k. Hyperpyramids contain
                 pyramids as proper subgraphs. We show that a
                 hyperpyramid P(k,d) can be embedded in a hypercube with
                 minimal expansion and dilation=d. The congestion is
                 bounded from above by ((2/sup d/-I)/d) and from below
                 by 1+((2/sup d/-d)/(kd+1)). We also present embeddings
                 of a hyperpyramid P(k,d) together with 2/sup d/-2
                 hyperpyramids P(k-1,d) such that only one hypercube
                 node is unused. The dilation of the embedding is d+1,
                 with a congestion of O(2/sup d/). A corollary is that a
                 complete n-ary tree can be embedded in a hypercube with
                 dilation=max(2,(log$_2$n)) and expansion=(2/sup
                 k(log(2/ n)+1))(n-1)/(n/sup k+1/-1).",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Almaden Res. Center, San Jose, CA, USA",
  classcodes =   "C4230M (Multiprocessor interconnection); C1160
                 (Combinatorial mathematics)",
  classification = "C1160 (Combinatorial mathematics); C4230M
                 (Multiprocessor interconnection)",
  corpsource =   "IBM Almaden Res. Center, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "congestion; Congestion; dilation; Dilation; embedded
                 hyperpyramid; Embedded hyperpyramid; expansion;
                 Expansion; graph theory; hypercube networks;
                 hypercubes; Hypercubes; interlevel node connections;
                 Interlevel node connections; leaf level; Leaf level;
                 level structure; Level structure; n-ary tree; N-ary
                 tree; pyramids; Pyramids; subcube; Subcube; subgraphs;
                 Subgraphs; telecommunication traffic",
  thesaurus =    "Graph theory; Hypercube networks; Telecommunication
                 traffic",
  treatment =    "T Theoretical or Mathematical",
}

@Article{McNutt:1994:BDM,
  author =       "B. McNutt",
  title =        "Background data movement in a log-structured disk
                 subsystem",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "47--58",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  abstract =     "The log-structured disk subsystem is a new concept for
                 the use of disk storage whose future application has
                 enormous potential. In such a subsystem, all writes are
                 organized into a log, each entry of which is placed
                 into the next available free storage. A directory
                 indicates the physical location of each logical object
                 (e.g., each file block or track image) as known to the
                 processor originating the I/O request. For those
                 objects that have been written more than once, the
                 directory retains the location of the most recent copy.
                 Other work with log-structured disk subsystems has
                 shown that they are capable of high write throughputs.
                 However, the fragmentation of free storage due to the
                 scattered locations of data that become out of date can
                 become a problem in sustained operation. To control
                 fragmentation, it is necessary to perform ongoing
                 garbage collection, in which the location of stored
                 data is shifted to release unused storage for re-use.
                 This paper introduces a mathematical model of garbage
                 collection, and shows how collection load relates to
                 the utilization of storage and the amount of locality
                 present in the pattern of updates. A realistic
                 statistical model of updates, based upon trace data
                 analysis, is applied. In addition, alternative policies
                 are examined for determining which data areas to
                 collect. The key conclusion of our analysis is that in
                 environments with the scattered update patterns typical
                 of database I/O, the utilization of storage must be
                 controlled in order to achieve the high write
                 throughput of which the subsystem is capable. In
                 addition, the presence of data locality makes it
                 important to take the past history of data into account
                 in determining the next area of storage to be
                 garbage-collected.",
  acknowledgement = ack-nhfb,
  affiliation =  "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
  classcodes =   "C6120 (File organisation); C5320C (Storage on moving
                 magnetic media)",
  classification = "C5320C (Storage on moving magnetic media); C6120
                 (File organisation)",
  corpsource =   "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "background data movement; Background data movement;
                 collection load; Collection load; data analysis; data
                 history; Data history; data locality; Data locality;
                 data structures; database I/O; Database I/O; directory;
                 Directory; disk storage; Disk storage; free storage
                 fragmentation; Free storage fragmentation; garbage
                 collection; Garbage collection; I/O; I/O request;
                 log-structured disk subsystem; Log-structured disk
                 subsystem; magnetic disc storage; model; most recent
                 copy; Most recent copy; optical disc storage; release;
                 request; scattered data locations; Scattered data
                 locations; statistical; Statistical model; statistics;
                 storage; storage management; storage reuse; Storage
                 reuse; Storage utilization; stored data location;
                 Stored data location; sustained operation; Sustained
                 operation; throughputs; trace data analysis; Trace data
                 analysis; unused storage; Unused storage release;
                 update pattern; Update pattern; utilization; write;
                 Write throughputs",
  thesaurus =    "Data analysis; Data structures; Magnetic disc storage;
                 Optical disc storage; Statistics; Storage management",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Vassiliadis:1994:SSC,
  author =       "S. Vassiliadis and B. Blaner and R. J. Eickemeyer",
  title =        "{SCISM}: a {Scalable Compound Instruction Set
                 Machine}",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "59--78",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html#five",
  abstract =     "In this paper we describe a machine organization
                 suitable for RISC and CISC architectures. The proposed
                 organization reduces hardware complexity in parallel
                 instruction fetch and issue logic by minimizing
                 possible increases in cycle time caused by parallel
                 instruction issue decisions in the instruction buffer.
                 Furthermore, it improves instruction-level parallelism
                 by means of special features. The improvements are
                 achieved by analyzing instruction sequences and
                 deciding which instructions will issue and execute in
                 parallel prior to actual instruction fetch and issue,
                 by incorporating preprocessed information for parallel
                 issue and execution of instructions in the cache, by
                 categorizing instructions for parallel issue and
                 execution on the basis of hardware utilization rather
                 than opcode description, by attempting to avoid memory
                 interlocks through the preprocessing mechanism, and by
                 eliminating execution interlocks with specialized
                 hardware.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM RISC Syst., Austin, TX, USA",
  classcodes =   "C5220 (Computer architecture); C5440 (Multiprocessor
                 systems and techniques)",
  classification = "C5220 (Computer architecture); C5440 (Multiprocessor
                 systems and techniques)",
  corpsource =   "IBM RISC Syst., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "buffer storage; cache; Cache; CISC architectures;
                 computer architecture; cycle time; Cycle time;
                 decisions; execution; execution interlocks; Execution
                 interlocks; hardware; hardware complexity; Hardware
                 complexity; Hardware utilization; instruction;
                 instruction buffer; Instruction buffer; instruction
                 categorization; Instruction categorization; Instruction
                 execution; instruction issue; Instruction issue
                 decisions; Instruction sequence analysis;
                 instruction-level parallelism; Instruction-level
                 parallelism; logic; logic design; machine; Machine
                 organization; memory interlocks; Memory interlocks;
                 multiprocessing systems; opcode description; Opcode
                 description; organization; parallel instruction fetch
                 and issue; Parallel instruction fetch and issue logic;
                 preprocessed information; Preprocessed information;
                 reduced instruction set computing; RISC architectures;
                 Scalable Compound Instruction Set Machine; SCISM;
                 sequence analysis; specialized hardware; Specialized
                 hardware; utilization",
  thesaurus =    "Buffer storage; Computer architecture; Logic design;
                 Multiprocessing systems; Reduced instruction set
                 computing",
  treatment =    "P Practical",
}

@Article{Kogge:1994:P,
  author =       "P. M. Kogge",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "115--115",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:07:52 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#one",
  abstract =     "Throughout the nearly four decades of its existence,
                 IBM's Federal Systems Company (FSC) has been a
                 software, systems, and products company with
                 significant underpinnings in advanced technology. Its
                 mission has been primarily to furnish IBM's largest
                 customer, the U.S. Government, with information
                 management solutions in a wide variety of areas. One
                 major emphasis that dates back to FSC's earliest years
                 a IBM's Military Products Division --- and later as
                 IBM's Federal Systems Division --- has been on fast,
                 embedded, and real-time-oriented computers for
                 specialized purposes. Examples range from systems for
                 U.S. military aircraft and submarines to reliable space
                 systems, such as those used on the Saturn IV moon
                 rocked and the Space Shuttle. A paper in the 25th
                 anniversary issue (September 1981) of this journal by
                 Olsen and Orrange summarizes many of FSC's earliest
                 achievements in this area. Much of that is regarded
                 today as structured programming has its origins in FSC
                 achievements such as the Real Time Computing Complex
                 (RTCC) for NASA's Mission Control and the
                 mission-critical software aboard the Space Shuttle.
                 Another paper in the 25th anniversary issue, this one
                 by James, documents some of the RTCC achievements.
                 Beginning in the early 1980s, the scope of FSC's
                 efforts expanded dramatically. A wide range of
                 ground-based problems began to emerge that could be
                 addressed with standard commercial equipment but
                 required FSC's expertise with real-time systems and
                 algorithms, as well as its ability to manage large
                 programming efforts. Examples include the ground
                 control system for the constellation of Global
                 Positioning System (GPS) satellites and the air traffic
                 control systems for the Federal Aviation Administration
                 (FAA). The late 1980s saw a further expansion of the
                 scope of its efforts, to the addressing of
                 computationally intensive problems in the non-aerospace
                 branches of the U.S. Government, such as its Treasury,
                 Postal, and Justice departments; problems that
                 complemented federal needs, such as those associated
                 with computer-integrated manufacturing; and problems of
                 concern to other governments for which variations of
                 FSC's expertise could provide cost-effective solutions.
                 This, coupled with the organizational flexibility to
                 deal with worldwide customers, led to its designation
                 as the Federal Systems Company. The papers in this
                 issue provide a sampling of recent FSC efforts. The
                 first two papers in the issue pertain to new classes of
                 algorithms for basic but widespread functions. The
                 paper by Bradford describes algorithms that extend the
                 use of Fourier methods for solving the Poisson
                 equation. The paper by Gozzo describes recursive
                 least-squares algorithms that promise performance
                 improvements in the reception of digital signals over
                 channels with intersymbol interference and white
                 Gaussian noise. Both classes of algorithms were
                 developed while the authors were receiving their Ph.D.
                 degrees under the IBM Resident Fellowship Program and
                 reflect needs the authors had observed prior to their
                 participation in the program. The papers by Pritt, by
                 Stiles and Glickstein, and by Arbabi et al. pertain to
                 methods developed to address a specific class of
                 applications. Pritt describes an algorithm for aligning
                 two or more images to ``match'' at certain points. This
                 is a typical step in the processing of images from
                 earth-observing satellites. With the anticipated flood
                 of data from such satellites in the future, this
                 approach is expected to become increasingly important.
                 Stiles and Glickstein describe another algorithm of
                 this sort. In their case, the problem is the
                 ``optimal'' routing of a vehicle from one point to
                 another in multidimensional space, where the definition
                 of ``optimality'' can vary dramatically from
                 application to another, and where additional
                 constraints such as time, fuel, ruggedness of terrain,
                 and various man-made features all conspire to
                 complicate the problem. Uses of this approach range
                 from routing military aircraft in combat situations,
                 through unmanned ``autonomous'' vehicle navigation, to
                 direction fleets of vehicles under changing traffic and
                 pickup points. \par

                 The paper by Arbabi et al. addresses the
                 transliteration of Arabic names into non-Arabic
                 languages. It is an example of the emerging
                 multinational aspects of FSC's customers' needs and the
                 use of ``artificial intelligence'' methods. \par

                 The final two papers, by Rudd et al. and Johnson et al,
                 pertain to efforts closer to achieving a complete
                 customer solution. The paper by Rudd et al. describes
                 part of a 25-year involvement by FSC in using satellite
                 data to detect and track ballistic missile launches.
                 The increasing amount and resolution of data from such
                 satellites, couples with increased demands for more
                 timely and detailed results, have forced continuing
                 efforts to understand launch and tracking phenomena,
                 and the algorithms needed to process tracking data.
                 \par

                 The paper by Johnson et al. reflects a similar
                 long-term involvement by FSC. It describes efforts to
                 scramble and unscramble data in cost-efficient ways
                 while still maintaining a high degree of
                 confidentiality in the data being transferred.
                 Questions dealing with code strength, interoperability,
                 and exportability to non-U.S. customers are all
                 critical here and are reflected in a new approach.
                 \par

                 Peter Kogge IBM Fellow Federal Systems Company Guest
                 Editor",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Bradford:1994:FST,
  author =       "B. L. Bradford",
  title =        "The {Fast Staggered Transform}, composite symmetries,
                 and compact symmetric algorithms",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "117--129",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:07:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#two",
  ZMnumber =     "814.65141",
  abstract =     "The Fast Staggered Transform (FST) is a variant of the
                 fast Fourier transform (FFT) and is introduced to
                 simplify and unify Fourier methods for the Poisson
                 equation with boundary conditions specified on a
                 staggered grid --- one for which the boundary of the
                 computational domain does not coincide with grid
                 points, but is staggered at half grid spacings.
                 Composite symmetric extensions of the computational
                 domain are introduced for cases in which the boundary
                 conditions are nonsymmetric. For example, one boundary
                 may coincide with grid points while the opposite
                 boundary is staggered. This is referred to as a mixed
                 grid. Compact symmetric FFT and FST algorithms are a
                 relatively new family of algorithms which offer
                 significant performance improvements compared to
                 traditional pre- and post-processing algorithms. The
                 results of performance tests of both types of
                 algorithms are presented. Furthermore, compact
                 symmetric algorithms make possible the application of
                 Fourier methods to six mixed grid boundary conditions
                 which previously could not be treated by Fourier
                 methods.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Boulder, CO, USA",
  classcodes =   "B0290Z (Other numerical methods); B0230 (Integral
                 transforms)C4190 (Other numerical methods); C1130
                 (Integral transforms)",
  classification = "B0230 (Integral transforms); B0290Z (Other numerical
                 methods); C1130 (Integral transforms); C4190 (Other
                 numerical methods)",
  corpsource =   "IBM Federal Syst. Co., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Boundary conditions; boundary conditions;
                 boundary-value problems; compact; Compact symmetric
                 algorithms; Composite symmetries; composite symmetries;
                 computational; Computational domain boundary; domain
                 boundary; equation; Fast Fourier transform; fast
                 Fourier transform; fast Fourier transforms; fast
                 staggered transform; Fast staggered transform; Half
                 grid spacings; half grid spacings; improvements; mixed
                 grid; Mixed grid; performance; performance evaluation;
                 Performance improvements; Poisson; Poisson equation;
                 Staggered grid; staggered grid; symmetric algorithms",
  thesaurus =    "Boundary-value problems; Fast Fourier transforms;
                 Performance evaluation",
  treatment =    "N New Development; T Theoretical or Mathematical",
}

@Article{Gozzo:1994:RLS,
  author =       "F. Gozzo",
  title =        "Recursive least-squares sequence estimation",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "131--156",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:08:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#three",
  abstract =     "A family of adaptive communication receivers based on
                 recursive least-squares sequence estimation (RLSSE)
                 algorithms is proposed which provides performance
                 comparable to that of conventional linear receivers,
                 but with reduced complexity and less sensitivity to
                 channel mismatch. A software-implemented version of the
                 linear member of the family is shown to have
                 performance equivalent to that of standard transversal
                 equalizers under ideal conditions, yet offers a drastic
                 improvement in white Gaussian noise mismatch
                 environments. An analogous performance improvement for
                 several test channels is also shown for
                 software-implemented versions of the constrained
                 (nonlinear) members of the family over decision
                 feedback equalizers. Another advantage of the RLSSE
                 family of receivers may be its ease of implementation,
                 since it should be possible to combine the functions of
                 channel estimation and sequence estimation on the same
                 chip.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Owego, NY, USA",
  classcodes =   "B6140 (Signal processing and detection); B5230
                 (Electromagnetic compatibility and interference); B6220
                 (Stations and subscriber equipment); B6250 (Radio links
                 and equipment); B6110 (Information theory); B0290F
                 (Interpolation and function approximation); C1260
                 (Information theory); C4130 (Interpolation and function
                 approximation)",
  classification = "B0290F (Interpolation and function approximation);
                 B5230 (Electromagnetic compatibility and interference);
                 B6110 (Information theory); B6140 (Signal processing
                 and detection); B6220 (Stations and subscriber
                 equipment); B6250 (Radio links and equipment); C1260
                 (Information theory); C4130 (Interpolation and function
                 approximation)",
  corpsource =   "IBM Federal Syst. Co., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adaptive; Adaptive communication receivers; Channel
                 estimation; channel estimation; channel mismatch;
                 Channel mismatch; communication receivers; equalisers;
                 equipment; feedback; filtering and prediction theory;
                 implemented version; intersymbol interference; least
                 squares approximations; noise; receivers; Recursive
                 least-squares sequence estimation; recursive
                 least-squares sequence estimation; software-;
                 Software-implemented version; telecommunication;
                 telecommunication channels; Transversal equalizers;
                 transversal equalizers; white Gaussian; White Gaussian
                 noise; white noise",
  thesaurus =    "Equalisers; Feedback; Filtering and prediction theory;
                 Intersymbol interference; Least squares approximations;
                 Receivers; Telecommunication channels;
                 Telecommunication equipment; White noise",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Pritt:1994:ASI,
  author =       "M. D. Pritt",
  title =        "Automated subpixel image registration of remotely
                 sensed imagery",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "157--166 (or 157--165??)",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#four",
  abstract =     "An algorithm is described for the automated
                 registration of remotely sensed imagery that registers
                 $6000 \times 6000$ pixel images in 8--18 minutes on an
                 IBM RISC System\slash 6000 workstation. The resulting
                 registration is accurate to the subpixel level even in
                 the presence of noise and large areas of change in the
                 images. It is shown that the registration mapping
                 function for parallel projections has the form
                 $F(x,y)=A(x,y)+h(x,y)e$, where $A(x,y)$ is an affine
                 transformation, $h(x,y)$ is a function that depends on
                 the topographic heights, and $e$ is a vector that
                 defines the epipolar lines. The algorithm determines
                 the parameters of this equation using only the image
                 data, without knowledge of the viewing orientations or
                 scene point coordinates. The search for match points is
                 then a one-dimensional search along the epipolar lines,
                 which greatly increases the speed and accuracy of the
                 registration.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Gaithersburg, MD, USA",
  classcodes =   "A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); A9365
                 (Data acquisition, processing and storage); B7730
                 (Other remote sensing applications); B6140C (Optical
                 information and image processing); C5260B (Computer
                 vision and picture processing); C7340 (Geophysics)",
  classification = "A9365 (Data acquisition, processing and storage);
                 A9385 (Instrumentation and techniques for geophysical,
                 hydrospheric and lower atmosphere research); B6140C
                 (Optical information and image processing); B7730
                 (Other remote sensing applications); C5260B (Computer
                 vision and picture processing); C7340 (Geophysics)",
  corpsource =   "IBM Federal Syst. Co., Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "affine transformation; Affine transformation;
                 automated subpixel image registration; Automated
                 subpixel image registration; changing; Changing images;
                 computing; epipolar; Epipolar lines; geophysics
                 computing; IBM computers; IBM RISC System/6000
                 workstation; image processing; imagery; images; lines;
                 match points searching; Match points searching;
                 microcomputer applications; noise; Noise;
                 one-dimensional search; One-dimensional search;
                 parallel projections; Parallel projections; reduced
                 instruction set; registration mapping function;
                 Registration mapping function; remote sensing; remotely
                 sensed; Remotely sensed imagery; topographic heights;
                 Topographic heights; vector; Vector",
  thesaurus =    "Geophysics computing; IBM computers; Image processing;
                 Microcomputer applications; Reduced instruction set
                 computing; Remote sensing",
  treatment =    "P Practical; T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Stiles:1994:HPR,
  author =       "P. N. Stiles and I. S. Glickstein",
  title =        "Highly parallelizable route planner based on cellular
                 automata algorithms",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "167--181",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#five",
  ZMnumber =     "939.68829",
  abstract =     "An overview is presented of our work on a highly
                 parallelizable route planner that efficiently finds an
                 optimal route between two points; both serial and
                 massively parallel implementations are described. We
                 compare the advantages and disadvantages of the
                 associated search algorithm relative to other search
                 algorithms, and conclude with a discussion of future
                 extensions and related applications.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Owego, NY, USA",
  classcodes =   "C1290H (Transportation); C4240P (Parallel programming
                 and algorithm theory); C4220 (Automata theory); C1180
                 (Optimisation techniques); C1160 (Combinatorial
                 mathematics)",
  classification = "C1160 (Combinatorial mathematics); C1180
                 (Optimisation techniques); C1290H (Transportation);
                 C4220 (Automata theory); C4240P (Parallel programming
                 and algorithm theory)",
  corpsource =   "IBM Federal Syst. Co., Owego, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; algorithms; cellular automata; Cellular
                 automata algorithms; highly parallelizable route
                 planner; Highly parallelizable route planner; massively
                 parallel implementations; Massively parallel
                 implementations; operations research; parallel
                 algorithms; search; Search algorithm; search problems;
                 transportation",
  thesaurus =    "Cellular automata; Operations research; Parallel
                 algorithms; Search problems; Transportation",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Arbabi:1994:AAN,
  author =       "M. Arbabi and S. M. Fischthal and V. C. Cheng and E.
                 Bart",
  title =        "Algorithms for {Arabic} name transliteration",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "183--193",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:08:20 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#six",
  abstract =     "An Arabic name can be written in English with many
                 different spellings. For example, the name Sulayman is
                 written only one way in Arabic. In English, this name
                 is written in as many as forty different ways, such as
                 Salayman, Seleiman, Solomon, Suleiman, and Sylayman.
                 Currently, Arabic linguists manually transliterate
                 these names --- a slow, laborious, error-prone, and
                 time-consuming process. We present a hybrid algorithm
                 which automates this process in real time using neural
                 networks and a knowledge-based system to vowelize
                 Arabic. A supervised neural network filters out
                 unreliable names, passing the reliable names on to the
                 knowledge-based system for romanization. This approach,
                 developed at the IBM Federal Systems Company, is
                 applicable to a wide variety of purposes, including
                 visa processing and document processing by border
                 patrols.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Gaithersburg, MD, USA",
  classcodes =   "C7820 (Humanities); C5290 (Neural computing
                 techniques); C6170 (Expert systems)",
  classification = "C5290 (Neural computing techniques); C6170 (Expert
                 systems); C7820 (Humanities)",
  corpsource =   "IBM Federal Syst. Co., Gaithersburg, MD, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Arabic linguists; Arabic name transliteration; border
                 patrols; Border patrols; document; Document processing;
                 hybrid algorithm; Hybrid algorithm; knowledge based
                 systems; knowledge-based system; Knowledge-based
                 system; linguistics; neural nets; neural network;
                 processing; real-time; real-time automatic process;
                 Real-time automatic process; romanization;
                 Romanization; spellings; Spellings; supervised;
                 Supervised neural network; systems; unreliable names;
                 Unreliable names; visa processing; Visa processing;
                 vowelization; Vowelization",
  thesaurus =    "Knowledge based systems; Linguistics; Neural nets;
                 Real-time systems",
  treatment =    "P Practical",
}

@Article{Rudd:1994:STB,
  author =       "J. G. Rudd and R. A. Marsh and J. A. Roecker",
  title =        "Surveillance and tracking of ballistic missile
                 launches",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "195--216",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:08:28 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#seven",
  abstract =     "This paper begins with an overview of system
                 requirements and design issues that must be considered
                 in the design of algorithms and software for the
                 surveillance and tracking of ballistic missile
                 launches. Detection and tracking algorithms and
                 approaches are then described for the processing of
                 data from a single satellite and from multiple
                 satellites. We cover track formation, missile
                 detection, track extension, and global arbitration, and
                 indicate how these functions fit together coherently.
                 We include both profile-dependent and profile-free
                 aspects of detection, tracking, and estimation of
                 tactical parameters. In some instances, particularly in
                 the area of track monitoring and in a discussion of how
                 we accommodate intersatellite bias errors in
                 line-of-sight measurements, we describe original work
                 that has not been previously reported in the technical
                 literature.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Boulder, CO, USA",
  classcodes =   "B7950 (Radar and tracking systems); B6140C (Optical
                 information and image processing); C7460 (Aerospace
                 engineering); C5260B (Computer vision and picture
                 processing)C1250 (Pattern recognition)",
  classification = "B6140C (Optical information and image processing);
                 B7950 (Radar and tracking systems); C1250 (Pattern
                 recognition); C5260B (Computer vision and picture
                 processing); C7460 (Aerospace engineering)",
  corpsource =   "IBM Federal Syst. Co., Boulder, CO, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "arbitration; artificial satellites; ballistic missile
                 launches; Ballistic missile launches; global; Global
                 arbitration; image recognition; missile detection;
                 Missile detection; missiles; surveillance;
                 Surveillance; track extension; Track extension; track
                 formation; Track formation; track monitoring; Track
                 monitoring; tracking",
  thesaurus =    "Artificial satellites; Image recognition; Missiles;
                 Tracking",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Johnson:1994:CDM,
  author =       "D. B. Johnson and S. M. Matyas and A. V. Le and J. D.
                 Wilkins",
  title =        "The {Commercial Data Masking Facility} ({CDMF}) data
                 privacy algorithm",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "217--226",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html#eight",
  ZMnumber =     "939.68622",
  abstract =     "The Commercial Data Masking Facility (CDMF) algorithm
                 defines a scrambling technique for data confidentiality
                 that uses the Data Encryption Algorithm (DEA) as the
                 underlying cryptographic algorithm, but weakens the
                 overall cryptographic operation by defining a
                 key-generation method that produces an effective 40-bit
                 DEA key instead of the 56 bits required by the
                 full-strength DEA. In general, products implementing
                 the CDMF algorithm in an appropriate manner may be
                 freely exported from the USA. The algorithm is thus
                 intended as a drop-in replacement for the DEA in
                 cryptographic products. Discussed in this paper are the
                 design requirements, rationale, strength, and
                 applications of the CDMF algorithm.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Federal Syst. Co., Manassas, VA, USA",
  classcodes =   "C6130S (Data security)",
  classification = "C6130S (Data security)",
  corpsource =   "IBM Federal Syst. Co., Manassas, VA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; CDMF; commercial data masking facility;
                 Commercial data masking facility; cryptographic
                 algorithm; Cryptographic algorithm; cryptography; data
                 confidentiality; Data confidentiality; Data Encryption
                 Algorithm; data privacy; Data privacy; Data privacy
                 algorithm; key-generation; Key-generation",
  thesaurus =    "Cryptography; Data privacy",
  treatment =    "P Practical",
}

@Article{Anonymous:1994:RIPb,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "239--240",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:08:37 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Winograd:1994:PMS,
  author =       "S. Winograd and A. J. Hoffman",
  title =        "Preface: {Mathematical Sciences Department, IBM Thomas
                 J. Watson Research Center}",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "242--242",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#one",
  abstract =     "At various times, the IBM Journal of Research and
                 Development has presented special issues on the work of
                 the Mathematical Sciences Department at the IBM Thomas
                 J. Watson Research Center. Most recently, it published
                 in 1987 the proceedings of a symposium celebrating the
                 Department's 25th anniversary. The papers presented in
                 this issue are our response to the editor's kind
                 invitation to present samples of out current work. The
                 vitality of the Mathematical Sciences Department
                 depends on a lively interaction with people in science,
                 engineering, and business who use mathematics to solve
                 their problems, and with the world community of
                 mathematicians who are engaged in cooperatively
                 advancing mathematical knowledge. The Department's
                 position as part if the IBM Thomas J. Watson Research
                 Center confers special responsibilities and
                 opportunities. We are in a unique position to have our
                 mathematical work influenced by what we learn from
                 interacting with the world of business and product
                 development, while at the same time benefitting IBM and
                 its customers by the application of our mathematical
                 knowledge and expertise. The papers in this special
                 issue reflect the spectrum of our activities, ranging
                 from exploiting special features of IBM computers and
                 improving algorithmic performance, to solving problems
                 intrinsic to mathematics. No collection of eight papers
                 can do justice to the wide variety of activities of the
                 Department. While the papers in this special issue are
                 a representative sample of what we do, we hope that
                 other parts of our work will be exposed to the readers
                 of this journal in issues to come.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Coppersmith:1994:DES,
  author =       "D. Coppersmith",
  title =        "The {Data Encryption Standard} ({DES}) and its
                 strength against attacks",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "243--250",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 09:58:53 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#two",
  ZMnumber =     "939.68623",
  abstract =     "The Data Encryption Standard (DES) was developed by an
                 IBM team around 1974 and adopted as a national standard
                 in 1977. Since that time, many cryptanalysts have
                 attempted to find shortcuts for breaking the system. In
                 this paper, we examine one such attempt, the method of
                 differential cryptanalysis, published by Biham and
                 Shamir. We show some of the safeguards against
                 differential cryptanalysis that were built into the
                 system from the beginning, with the result that more
                 than $10^{15}$ bytes of chosen plaintext are required
                 for this attack to succeed.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "B6120B (Codes); C6130S (Data security)",
  classification = "B6120B (Codes); C6130S (Data security)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "attacks; Attacks; breaking; cryptography; Data
                 Encryption Standard; differential cryptanalysis;
                 Differential cryptanalysis; IBM team; plaintext;
                 Plaintext; safeguards; Safeguards; standards; system;
                 System breaking",
  thesaurus =    "Cryptography; Standards",
  treatment =    "P Practical",
}

@Article{Hosking:1994:FKD,
  author =       "J. R. M. Hosking",
  title =        "The four-parameter kappa distribution",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "251--258",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:08:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#three",
  abstract =     "Many common probability distributions, including some
                 that have attracted recent interest for flood-frequency
                 analysis, may be regarded as special cases of a
                 four-parameter distribution that generalizes the
                 three-parameter kappa distribution of P. W. Mielke
                 (1973). This four-parameter kappa distribution can be
                 fitted to experimental data or used as a source of
                 artificial data in simulation studies. This paper
                 describes some of the properties of the four-parameter
                 kappa distribution, and gives an example in which it is
                 applied to modeling the distribution of annual maximum
                 precipitation data.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C1140 (Probability and statistics)",
  classification = "C1140 (Probability and statistics)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "annual maximum; Annual maximum precipitation data;
                 climatology; distributions; flood-frequency analysis;
                 Flood-frequency analysis; four-parameter kappa
                 distribution; Four-parameter kappa distribution; kappa
                 distribution; precipitation data; probability;
                 Probability distributions; rain; simulation studies;
                 Simulation studies; three-parameter; Three-parameter
                 kappa distribution",
  thesaurus =    "Climatology; Probability; Rain",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Shub:1994:IFT,
  author =       "M. Shub",
  title =        "The implicit function theorem revisited",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "259--264",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#four",
  abstract =     "This paper is a survey of some results on Newton's
                 method as applied to the implicit function theorem,
                 homotopy methods, and Bezout's theorem. An application
                 to macroeconomics is also described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C4150 (Nonlinear and functional equations); C1290D
                 (Economics and business)",
  classification = "C1290D (Economics and business); C4150 (Nonlinear
                 and functional equations)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; Bezout's theorem; economic cybernetics;
                 equation solving; homotopy; Homotopy methods; implicit
                 function theorem; Implicit function theorem;
                 macroeconomics; Macroeconomics; methods; Newton's
                 method; nonlinear; Nonlinear equation solving;
                 nonlinear equations; numerical",
  thesaurus =    "Economic cybernetics; Nonlinear equations; Numerical
                 analysis",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Agarwal:1994:IPL,
  author =       "R. C. Agarwal and F. G. Gustavson and M. Zubair",
  title =        "Improving performance of linear algebra algorithms for
                 dense matrices, using algorithmic prefetch",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "265--275",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#five",
  ZMnumber =     "826.68051",
  abstract =     "In this paper, we introduce a concept called
                 algorithmic prefetching, for exploiting some of the
                 features of the IBM RISC System\slash 6000* computer.
                 Algorithmic prefetching denotes changing algorithm A to
                 algorithm B, which contains additional steps to move
                 data from slower levels of memory to faster levels,
                 with the aim that algorithm B outperform algorithm A.
                 The objective of algorithmic prefetching is to minimize
                 any penalty due to cache misses in the innermost loop
                 of an algorithm. This concept, along with ``cache
                 blocking,'' can be exploited to improve the performance
                 of linear algebra algorithms for dense matrices. We
                 experimentally demonstrated the impact of prefetching
                 on two dense-matrix operations. For one operation, the
                 performance was improved from 74\% of peak to 89\% of
                 peak by algorithmic prefetching; for the second
                 operation, it was improved from 73\% to 87\% of the
                 peak performance.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C4140 (Linear algebra); C4240 (Programming and
                 algorithm theory)",
  classification = "C4140 (Linear algebra); C4240 (Programming and
                 algorithm theory)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm theory; algorithmic; Algorithmic prefetch;
                 buffer storage; cache blocking; Cache blocking; dense
                 matrices,; Dense matrices,; IBM RISC System/6000
                 computer; linear algebra algorithms; Linear algebra
                 algorithms; matrix algebra; prefetch",
  thesaurus =    "Algorithm theory; Buffer storage; Matrix algebra",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Mhaskar:1994:DIB,
  author =       "H. N. Mhaskar and C. A. Micchelli",
  title =        "Dimension-independent bounds on the degree of
                 approximation by neural networks",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "277--284",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 12:42:20 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#six",
  ZMnumber =     "823.41012",
  abstract =     "Let $\phi$ be a univariate $2 \pi$-periodic function.
                 Suppose that $s >= 1$ and $f$ is a $2 \pi$-periodic
                 function of $s$ real variables. We study sufficient
                 conditions in order that a neural network having a
                 single hidden layer consisting of $n$ neurons, each
                 with an activation function $\phi$, can be constructed
                 so as to give a mean square approximation to $f$ within
                 a given accuracy $\epsilon_n$, independent of the
                 number of variables. We also discuss the case in which
                 the activation function $\phi$ is not
                 $2\pi$-periodic.",
  acknowledgement = ack-nhfb,
  affiliation =  "Dept. of Maths. and Comput. Sci., California State
                 Univ., Los Angeles, CA, USA",
  classcodes =   "C1230D (Neural nets); C4130 (Interpolation and
                 function approximation); C5290 (Neural computing
                 techniques)",
  classification = "C1230D (Neural nets); C4130 (Interpolation and
                 function approximation); C5290 (Neural computing
                 techniques)",
  corpsource =   "Dept. of Maths. and Comput. Sci., California State
                 Univ., Los Angeles, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "activation function; Activation function; degree of
                 approximation; Degree of approximation;
                 dimension-independent bounds; Dimension-independent
                 bounds; feedforward neural nets; function
                 approximation; functions; hidden layer; mean square
                 approximation; Mean square approximation; neural
                 networks; Neural networks; single; Single hidden layer;
                 transfer; univariate 2 pi -periodic function;
                 Univariate 2 pi -periodic function",
  thesaurus =    "Feedforward neural nets; Function approximation;
                 Transfer functions",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Chesshire:1994:EPD,
  author =       "G. Chesshire and V. K. Naik",
  title =        "An environment for parallel and distributed
                 computation with application to overlapping grids",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "285--300",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#seven",
  abstract =     "We describe an environment for efficient and scalable
                 implementation of large scientific applications on
                 parallel and distributed computing systems. We show how
                 this environment is used to support overlapping grid
                 methods. In addition to providing a user interface that
                 reduces programming complexity, the environment
                 facilitates dynamic partitioning of data and the
                 scheduling of both computations and communication,
                 transparent to the user. After describing the user
                 interface and some of the implementation issues, we
                 present performance data for a model application
                 executed on two different systems: an eight-processor
                 IBM Power Parallel Prototype (PPP) system and a
                 32-processor IBM POWER Visualization System* (PVS).",
  acknowledgement = ack-nhfb,
  affiliation =  "Los Alamos Nat. Lab., NM, USA",
  classcodes =   "C6150N (Distributed systems); C6115 (Programming
                 support); C6160 (Database management systems (DBMS));
                 C6180 (User interfaces)",
  classification = "C6115 (Programming support); C6150N (Distributed
                 systems); C6160 (Database management systems (DBMS));
                 C6180 (User interfaces)",
  corpsource =   "Los Alamos Nat. Lab., NM, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "applications; computers; database management systems;
                 distributed computation; Distributed computation;
                 distributed memory systems; distributed-memory systems;
                 Distributed-memory systems; DSK; dynamic; Dynamic
                 partitioning; environments; FORTRAN programs;
                 hierarchical data; Hierarchical data structures; IBM;
                 IBM Power; IBM Power Parallel Prototype; IBM POWER
                 Visualization System; large scientific; Large
                 scientific applications; multiprocessing programs;
                 overlapping grids; Overlapping grids; parallel
                 computing; Parallel computing; Parallel Prototype;
                 partitioning; performance data; Performance data;
                 portable scientific database package; Portable
                 scientific database package; programming; scheduling;
                 Scheduling; structures; user interface; User interface;
                 user interfaces",
  thesaurus =    "Database management systems; Distributed memory
                 systems; IBM computers; Multiprocessing programs;
                 Programming environments; User interfaces",
  treatment =    "P Practical",
}

@Article{Denardo:1994:NAP,
  author =       "E. V. Denardo and A. J. Hoffman and T. Mackenzie and
                 W. R. Pulleyblank",
  title =        "A nonlinear allocation problem",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "301--306",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#eight",
  abstract =     "We consider the problem of deploying work force to
                 tasks in a project network for which the time required
                 to perform each task depends on the assignment of work
                 force to the task, for the purpose of minimizing the
                 time to complete the project. The rules governing the
                 deployment of work force and the resulting changes in
                 task times of our problem are discussed in the contexts
                 of (a) related work on project networks and (b) more
                 general allocation problems on polytopes. We prove
                 that, for these problems, the obvious lower bound for
                 project completion time is attainable.",
  acknowledgement = ack-nhfb,
  affiliation =  "Center for Syst. Sci., Yale Univ., New Haven, CT,
                 USA",
  classcodes =   "C1290F (Industry)",
  classification = "C1290F (Industry)",
  corpsource =   "Center for Syst. Sci., Yale Univ., New Haven, CT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "acyclic directed graph; Acyclic directed graph; lower
                 bound; Lower bound; network; nonlinear allocation
                 problem; Nonlinear allocation problem; PERT; PERT
                 network; polytopes; Polytopes; project completion time;
                 Project completion time; project management; project
                 network; Project network; resource allocation; work
                 force; Work force",
  thesaurus =    "PERT; Project management; Resource allocation",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Jensen:1994:CMB,
  author =       "D. L. Jensen and R. A. Polyak",
  title =        "The convergence of a modified barrier method for
                 convex programming",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "307--321",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html#nine",
  abstract =     "We show, using elementary considerations, that a
                 modified barrier function method for the solution of
                 convex programming problems converges for any fixed
                 positive setting of the barrier parameter. With mild
                 conditions on the primal and dual feasible regions, we
                 show how to use the modified barrier function method to
                 obtain primal and dual optimal solutions, even in the
                 presence of degeneracy. We illustrate the argument for
                 convergence in the case of linear programming, and then
                 generalize it to the convex programming case.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "B0260 (Optimisation techniques); B0290H (Linear
                 algebra); C1180 (Optimisation techniques); C4130
                 (Interpolation and function approximation)",
  classification = "B0260 (Optimisation techniques); B0290H (Linear
                 algebra); C1180 (Optimisation techniques); C4130
                 (Interpolation and function approximation)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "convergence; Convergence; convergence of numerical
                 methods; convex programming; Convex programming;
                 degeneracy; Degeneracy; feasible regions; Feasible
                 regions; fixed positive setting; Fixed positive
                 setting; linear; Linear programming; modified barrier
                 method; Modified barrier method; programming",
  thesaurus =    "Convergence of numerical methods; Convex programming;
                 Linear programming",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Mittal:1994:PAS,
  author =       "K. L. Mittal",
  title =        "Preface: Adhesion Science and Technology",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "346--346",
  month =        apr,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:13:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#one",
  abstract =     "Adhesion between similar or dissimilar materials is of
                 vital importance to IBM in the manufacture of products
                 such as multilayer electronic devices and integrated
                 circuits, printed circuit boards, and magnetic head and
                 disk assemblies. For products to function reliably and
                 reproducibly, ways must be devised to understand and
                 tailor the requisite adhesion strengths between
                 materials. Strictly speaking, adhesion is an
                 interfacial phenomenon, but the overall adhesion
                 strength, commonly referred to as practical adhesion,
                 is generally determined by the properties of an
                 interfacial region or ``interphase'' between the two
                 materials, which differ from those of the two
                 contiguous bulk phases. An interphase might be present
                 naturally or be created by interactions, such as
                 diffusion, between the adhering phases. Desirable
                 interphases are obtained by introducing coupling agents
                 or adhesion promoters, by enhancing interdiffusion, by
                 application of a surface modification technique, or by
                 eliminating unwanted surfaces. The ability to
                 accurately measure the properties of relevant surfaces
                 and interphases and correlate them with adhesion
                 strength enhances our understanding of the factors that
                 affect adhesion. The increased availability of modern
                 analytical techniques and experimental tools, as well
                 as novel theoretical approaches, has opened new vistas
                 to achieving this understanding. The eight papers in
                 this special issue of the IBM Journal of Research and
                 Development highlight developments in adhesion science
                 and technology that are currently of interest within
                 IBM. The first three papers focus on the fundamental
                 aspects of adhesion. In the first paper, Durig analyzes
                 metal tip-sample interactions which occur in a scanning
                 tunneling microscope during vacuum tunneling at
                 distances where electron wave functions overlap
                 appreciably. These interactions are associated with
                 adhesion at an atomic level. The next paper, by
                 Thouless, examines aspects of the fracture mechanics of
                 thin-film adhesion. The author reviews the essential
                 elements of the mechanics of delamination and discusses
                 their implications for flaw-tolerant design of
                 structures involving thin films. In the third paper,
                 Brown reviews recent work that relates to adhesion
                 between noninteracting polymers. Advances in the
                 understanding of adhesion failure between polymers and
                 the interpretation of adhesion tests are discussed. The
                 use of copolymers as coupling agents to improve
                 adhesion between immiscible polymers is also described.
                 The fourth paper, by Spool, reviews the application of
                 static and dynamic secondary ion mass spectroscopy
                 (SIMS) as analytical tools for identifying factors that
                 affect adhesion. The high mass resolution of SIMS makes
                 it particularly useful in identifying trace impurities
                 at surfaces and diffusion of species near the
                 interfacial region. Spool cites examples of the utility
                 of static SIMS in gaining an understanding of the
                 nature of failed surfaces, of pre-bonding treatments,
                 of adhesion-weakening contaminants, and of adhesion
                 promoters. The next four papers are primarily concerned
                 with ways to improve adhesion. The review paper by
                 Baglin focuses on ion beam techniques to improve
                 adhesion of thin films to a variety of substrates. The
                 techniques discussed are reactive and nonreactive ion
                 beam sputtering, ion-beam-assisted deposition, ion beam
                 stitching, and ion implantation. Eclectic examples are
                 cited to show enhancements in adhesion strengths that
                 are a result of ion beam treatments. The paper by
                 Egitto and Matienzo reviews plasma technology and its
                 ability to modify polymer surfaces to improve adhesion
                 characteristics without affecting the bulk properties
                 of the polymer. Plasmas enhance adhesion by removing
                 contaminants, roughening surfaces, and introducing
                 reactive chemical groups. In the next paper, Saraf et
                 al. demonstrate that adhesion to a flexible polyimide
                 surface can be enhanced after replacing a single
                 polyimide precursor with a blend of two precursors. An
                 improvement in adhesion to such a polyimide surface is
                 attributed to increased surface roughening, a more
                 isotropic polymer chain ordering within the film and a
                 modified near-surface morphology. The last paper, by
                 Lee and Viehbeck, is an overview of recent work on
                 wet-process surface modifications of polymers. Wet
                 processing is simple, low-cost processing that improves
                 adhesion to the polymers by introducing reactive
                 functional groups at the surface and by enhancing
                 interdiffusion between polymers. \par

                 In concluding, I wish to thank the authors of the
                 submitted papers and the referees and express my hope
                 that readers of this issue of the IBM Journal of
                 Research and Development will find the papers both
                 interesting and informative. \par

                 Dr. K. L. Mittal, Guest Editor 92 Saddle Ridge Drive
                 Hopewell Junction, NY 12533 Previous affiliation: Skill
                 Dynamics An IBM Company",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Durig:1994:ASM,
  author =       "U. D{\"u}rig",
  title =        "Atomic-scale metal adhesion investigated by scanning
                 tunneling microscopy",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "347--366",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#two",
  abstract =     "The interaction of a sharply pointed metal tip with a
                 metal surface is investigated both theoretically and
                 experimentally. By resorting to an effective potential
                 approach, the characteristics of tip-sample forces are
                 analyzed systematically in terms of known theory of
                 bulk metal adhesion. Experiments probing the
                 short-range adhesion interaction by means of a
                 combination of force gradient sensing with tunneling
                 microscopy are described. It is found that the concepts
                 based on adhesion at a macroscopic level are not
                 generally applicable in describing the observed
                 tip-sample force gradient characteristics. These
                 characteristics can, however, be explained in a
                 semiquantitative way using effective interactions
                 determined from a cluster calculation. It is also shown
                 that the chemical information obtained by probing
                 short-range interactions can be used to identify
                 adsorbates on metal surfaces.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Lab., Ruschlikon, Switzerland",
  classcodes =   "A6820 (Solid surface structure); A6116P (Scanning
                 tunnelling microscopy and related techniques); A8190
                 (Other topics in materials science)",
  classification = "A6116P (Scanning tunnelling microscopy and related
                 techniques); A6820 (Solid surface structure); A8190
                 (Other topics in materials science)",
  corpsource =   "IBM Res. Lab., Ruschlikon, Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; adhesion interaction; Adsorbates;
                 adsorbates; Atomic scale metal adhesion; atomic scale
                 metal adhesion; Cluster calculation; cluster
                 calculation; effective; Effective interactions;
                 Effective potential approach; effective potential
                 approach; Electron wave function overlap; electron wave
                 function overlap; exchange interactions (electron);
                 Exchange-correlation interaction; exchange-correlation
                 interaction; Force gradient sensing; force gradient
                 sensing; interactions; Metal surface; metal surface;
                 metals; microscopy; nanotechnology; scanning tunneling;
                 Scanning tunneling microscopy; scanning tunnelling
                 microscopy; Sharply pointed metal tip; sharply pointed
                 metal tip; short-range; Short-range adhesion
                 interaction; Tip-sample forces; tip-sample forces",
  thesaurus =    "Adhesion; Exchange interactions [electron]; Metals;
                 Nanotechnology; Scanning tunnelling microscopy",
  treatment =    "T Theoretical or Mathematical; X Experimental",
}

@Article{Thouless:1994:FMT,
  author =       "M. D. Thouless",
  title =        "Fracture mechanics for thin-film adhesion",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "367--377",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#three",
  abstract =     "The essential elements of the mechanics of
                 delamination are reviewed and their implications for
                 design are discussed. Two important concepts for the
                 prediction of the reliability of thin-film systems are
                 emphasized: (1) limiting solutions for the
                 crack-driving force that are independent of flaw size,
                 and (2) ``mixed-mode fracture.'' Consideration of the
                 first concept highlights the possibility of
                 flaw-tolerant design in which the statistical effects
                 associated with flaw distributions can be eliminated.
                 The significance of mode-mixedness includes its effect
                 on crack trajectories and on the interface toughness,
                 two key variables in determining failure mechanisms.
                 Theoretical predictions are given for some cases of
                 delamination of thin films under compressive stresses,
                 and the results are compared with experimental
                 observations to illustrate appropriate design criteria
                 for the model systems studied.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  classcodes =   "A8190 (Other topics in materials science); A0130R
                 (Reviews and tutorial papers; resource letters); A6860
                 (Physical properties of thin films, nonelectronic);
                 A8140N (Fatigue, embrittlement, and fracture); A6220M
                 (Fatigue, brittleness, fracture, and cracks); A8160
                 (Corrosion, oxidation, etching, and other surface
                 treatments)",
  classification = "A0130R (Reviews and tutorial papers; A6220M
                 (Fatigue, brittleness, fracture, and cracks); A6860
                 (Physical properties of thin films, nonelectronic);
                 A8140N (Fatigue, embrittlement, and fracture); A8160
                 (Corrosion, oxidation, etching, and other surface
                 treatments); A8190 (Other topics in materials science);
                 resource letters)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; compressive stresses; Compressive stresses;
                 crack trajectories; Crack trajectories; crack-driving
                 force; Crack-driving force; delamination; flaw-tolerant
                 design; Flaw-tolerant design; fracture; fracture
                 mechanics; interface toughness; Interface toughness;
                 limiting solutions; Limiting solutions; mechanics of
                 delamination; Mechanics of delamination; mixed-mode;
                 Mixed-mode fracture; reliability; Reliability; reviews;
                 thin films; thin-film adhesion; Thin-film adhesion;
                 toughness",
  thesaurus =    "Adhesion; Delamination; Fracture mechanics; Fracture
                 toughness; Reviews; Thin films",
  treatment =    "G General Review",
}

@Article{Brown:1994:ABP,
  author =       "H. R. Brown",
  title =        "Adhesion between polymers",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "379--389",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#four",
  abstract =     "This paper is concerned with recent work that relates
                 to the adhesion between nonreacting polymers. Advances
                 in the understanding of cracks at bimaterial interfaces
                 are considered, with particular emphasis on their
                 implications in the interpretation of adhesion tests.
                 An interpretation of the peel and blister tests is then
                 discussed. Consideration is given to mechanisms of
                 polymer failure as they relate to adhesion, with an
                 emphasis on the distinctions between the properties of
                 glassy and elastomeric materials. Polymer self-adhesion
                 and its relation to interdiffusion are reviewed and
                 compared with the adhesion of miscible polymers. In
                 considering the adhesion between immiscible polymers,
                 emphasis is given to the use of copolymers as coupling
                 agents at the interface.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almadens Res. Center, San Jose, CA,
                 USA",
  classcodes =   "A8190 (Other topics in materials science); A0130R
                 (Reviews and tutorial papers; resource letters); A6890
                 (Other topics in the structure and nonelectronic
                 properties of surfaces and thin films); A8170
                 (Materials testing)",
  classification = "A0130R (Reviews and tutorial papers; A6890 (Other
                 topics in the structure and nonelectronic properties of
                 surfaces and thin films); A8170 (Materials testing);
                 A8190 (Other topics in materials science); resource
                 letters)",
  corpsource =   "IBM Res. Div., Almadens Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; Adhesion; adhesion tests; Adhesion tests;
                 bimaterial interfaces; Bimaterial interfaces; blister
                 tests; Blister tests; copolymers; Copolymers; coupling
                 agents; Coupling agents; elastomeric materials;
                 Elastomeric materials; glassy materials; Glassy
                 materials; immiscible polymers; Immiscible polymers;
                 materials testing; miscible polymers; Miscible
                 polymers; nonreacting polymers; Nonreacting polymers;
                 peel tests; Peel tests; polyimides; Polyimides; polymer
                 blends; polymers; reviews; self-; Self-adhesion;
                 thermoplastics; Thermoplastics",
  thesaurus =    "Adhesion; Materials testing; Polymer blends; Polymers;
                 Reviews",
  treatment =    "B Bibliography; G General Review",
}

@Article{Spool:1994:SAS,
  author =       "A. M. Spool",
  title =        "Studies of adhesion by secondary ion mass
                 spectrometry",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "391--411",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#five",
  abstract =     "The study of adhesion requires the characterization of
                 surfaces and interfaces. One surface analytical
                 technique which has been used extensively in the study
                 of adhesion is secondary ion mass spectrometry (SIMS).
                 This paper provides a brief introduction to the basis
                 of this technique and describes the two broad
                 categories of SIMS analyses: static and dynamic. A
                 complete literature review of the applications of SIMS
                 to the study of adhesion follows. The papers reviewed
                 are organized into a series of topics including the
                 nature of surfaces produced by pre-bonding treatments,
                 contamination which produces adhesion loss, polymer
                 damage at interfaces, silanes and adhesion,
                 characterization of polymer/polymer interfaces, and
                 measurements of interface widths by SIMS.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Storage Syst. Div., San Jose, CA, USA",
  classcodes =   "A8280M (Mass spectrometry (chemical analysis)); A0130R
                 (Reviews and tutorial papers; resource letters); A8190
                 (Other topics in materials science); A7920N (Atom-,
                 molecule-, and ion-surface impact); A0775 (Mass
                 spectrometers and mass spectrometry techniques); A8170
                 (Materials testing); A6890 (Other topics in the
                 structure and nonelectronic properties of surfaces and
                 thin films)",
  classification = "A0130R (Reviews and tutorial papers; A0775 (Mass
                 spectrometers and mass spectrometry techniques); A6890
                 (Other topics in the structure and nonelectronic
                 properties of surfaces and thin films); A7920N (Atom-,
                 molecule-, and ion-surface impact); A8170 (Materials
                 testing); A8190 (Other topics in materials science);
                 A8280M (Mass spectrometry (chemical analysis));
                 resource letters)",
  corpsource =   "IBM Storage Syst. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; Adhesion; adhesion loss; Adhesion loss;
                 analytical technique; contamination; Contamination;
                 interface widths; Interface widths; mass spectroscopic
                 chemical analysis; polymer damage at interfaces;
                 Polymer damage at interfaces; polymer/polymer
                 interfaces; Polymer/polymer interfaces; polymers;
                 pre-bonding treatments; Pre-bonding treatments;
                 reviews; secondary ion mass spectrometry; Secondary ion
                 mass spectrometry; secondary ion mass spectroscopy;
                 silanes; Silanes; surface; Surface analytical
                 technique",
  thesaurus =    "Adhesion; Mass spectroscopic chemical analysis;
                 Polymers; Reviews; Secondary ion mass spectroscopy",
  treatment =    "B Bibliography; G General Review",
}

@Article{Baglin:1994:TFB,
  author =       "J. E. E. Baglin",
  title =        "Thin film bonding using ion beam techniques --- a
                 review",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "413--422",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#six",
  abstract =     "This review describes the established techniques of
                 reactive and nonreactive ion beam sputtering,
                 ion-beam-assisted deposition, ion implantation, and ion
                 beam stitching. It then presents representative
                 examples of adhesion enhancement selected from the
                 current literature, in order to clarify the roles of
                 interface chemistry, morphology, contaminants, and
                 stability. The review offers a basis upon which
                 interface tailoring for adhesion may be planned in
                 order to optimize both performance and fabrication of
                 specific materials systems.",
  abstract-2 =   "Ion beam technologies provide a variety of well-proven
                 means for creating or enhancing strong, stable, direct
                 adhesion of thin films deposited on substrates.
                 Interface chemical bonding and structure are critical.
                 Yet success with such approaches has been reported for
                 a great variety of systems that have little or no bulk
                 chemical affinity, including metals, polymers,
                 ceramics, and semiconductors. This review paper
                 describes the established techniques of reactive and
                 nonreactive ion beam sputtering, ion-beam-assisted
                 deposition, ion implantation, and ion beam stitching.
                 It then presents representative examples of adhesion
                 enhancement selected from the current literature, in
                 order to clarify the roles of interface chemistry,
                 morphology, contaminants, and stability. The review
                 offers a basis upon which interface tailoring for
                 adhesion may be planned in order to optimize both
                 performance and fabrication of specific materials
                 systems.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  classcodes =   "A8190 (Other topics in materials science); A0130R
                 (Reviews and tutorial papers; resource letters); A6860
                 (Physical properties of thin films, nonelectronic);
                 A7920N (Atom-, molecule-, and ion-surface impact);
                 A8115J (Ion plating and other vapour deposition);
                 A8115C (Deposition by sputtering); A8160 (Corrosion,
                 oxidation, etching, and other surface treatments);
                 B0500 (Materials science for electrical and electronic
                 engineering); B2550E (Surface treatment for
                 semiconductor devices)",
  classification = "A0130R (Reviews and tutorial papers; A6860 (Physical
                 properties of thin films, nonelectronic); A7920N
                 (Atom-, molecule-, and ion-surface impact); A8115C
                 (Deposition by sputtering); A8115J (Ion plating and
                 other vapour deposition); A8160 (Corrosion, oxidation,
                 etching, and other surface treatments); A8190 (Other
                 topics in materials science); B0500 (Materials science
                 for electrical and electronic engineering); B2550E
                 (Surface treatment for semiconductor devices); resource
                 letters)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; Adhesion enhancement; adhesion enhancement;
                 assisted deposition; Contaminants; contaminants;
                 deposition; implantation; interface chemistry;
                 Interface chemistry; interface structure; Interface
                 tailoring; interface tailoring; ion; ion beam; ion beam
                 applications; Ion beam stitching; ion beam stitching;
                 Ion beam techniques; ion implantation; Ion
                 implantation; ion-beam-; Ion-beam-assisted deposition;
                 joining processes; Morphology; morphology; nonreactive
                 ion beam sputtering; Nonreactive ion beam sputtering;
                 reactive ion beam sputtering; Reactive ion beam
                 sputtering; reviews; sputter; stability; Stability;
                 surface treatment; techniques; thin film bonding; Thin
                 film bonding; thin films",
  thesaurus =    "Adhesion; Interface structure; Ion beam applications;
                 Ion implantation; Joining processes; Reviews; Sputter
                 deposition; Surface treatment; Thin films",
  treatment =    "G General Review",
}

@Article{Egitto:1994:PMP,
  author =       "F. D. Egitto and L. J. Matienzo",
  title =        "Plasma modification of polymer surfaces for adhesion
                 improvement",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "423--439",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#seven",
  abstract =     "Polymers have wide-ranging applications in food
                 packaging and decorative products, and as insulation
                 for electronic devices. For these applications, the
                 adhesion of materials deposited onto polymer substrates
                 is of primary importance. Not all polymer surfaces
                 possess the required physical and/or chemical
                 properties for good adhesion. Plasma treatment is one
                 means of modifying polymer surfaces to improve adhesion
                 while maintaining the desirable properties of the bulk
                 material. This paper addresses the interaction of
                 organic surfaces with the various components of a
                 plasma, with examples taken from a review of the
                 pertinent literature.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Microelectron Div., Endicott, NY, USA",
  classcodes =   "A8160J (Surface treatment and degradation of polymers
                 and plastics); A0130R (Reviews and tutorial papers;
                 resource letters); A8190 (Other topics in materials
                 science); B0560 (Polymers and plastics (engineering
                 materials science)); B2550E (Surface treatment for
                 semiconductor devices)",
  classification = "A0130R (Reviews and tutorial papers; A8160J (Surface
                 treatment and degradation of polymers and plastics);
                 A8190 (Other topics in materials science); B0560
                 (Polymers and plastics (engineering materials
                 science)); B2550E (Surface treatment for semiconductor
                 devices); resource letters)",
  corpsource =   "IBM Microelectron Div., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; adhesion improvement; Adhesion improvement;
                 decorative; Decorative products; food packaging; Food
                 packaging; insulation for electronic devices;
                 Insulation for electronic devices; plasma applications;
                 plasma modification; Plasma modification;
                 plasma-polymer interactions; Plasma-polymer
                 interactions; polymer; Polymer surfaces; polymers;
                 products; reviews; surface; surfaces; treatment",
  thesaurus =    "Adhesion; Plasma applications; Polymers; Reviews;
                 Surface treatment",
  treatment =    "B Bibliography; G General Review",
}

@Article{Saraf:1994:TSM,
  author =       "R. F. Saraf and J. M. Roldan and T. Derderian",
  title =        "Tailoring the surface morphology of polyimide for
                 improved adhesion",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "441--456",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#eight",
  abstract =     "Semiflexible polyimide structures are not amenable to
                 good adhesion because of their (a) spontaneous
                 orientation of the polymer chains parallel to the film
                 substrate during curing, (b) formation of an ordered
                 skin, and (c) smooth surface topography. The authors
                 briefly discuss these structural features with regard
                 to metal-on-polyimide (metal/PI) adhesion. A method is
                 proposed to improve adhesion by tailoring the surface
                 and bulk morphology of the PI to circumvent these
                 properties. In this method, different precursors of the
                 same polyimide (PMDA-ODA) are blended. Phase separation
                 induces spontaneous roughening of the PI surface. This
                 novel technique reduces the extent of chain
                 orientation, gives rise to topographical and
                 morphological surface heterogeneities, and produces a
                 discontinuous ordered skin. A variety of topographical
                 features with nanoscale dimensions are produced that
                 range from `mounds' to `dimples'.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cu/int Cu/el",
  classcodes =   "A8160J (Surface treatment and degradation of polymers
                 and plastics); A6820 (Solid surface structure); A8190
                 (Other topics in materials science); A6140K (Structure
                 of polymers, elastomers, and plastics); B0560 (Polymers
                 and plastics (engineering materials science)); B2550E
                 (Surface treatment for semiconductor devices)",
  classification = "A6140K (Structure of polymers, elastomers, and
                 plastics); A6820 (Solid surface structure); A8160J
                 (Surface treatment and degradation of polymers and
                 plastics); A8190 (Other topics in materials science);
                 B0560 (Polymers and plastics (engineering materials
                 science)); B2550E (Surface treatment for semiconductor
                 devices)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; blended polyimide precursors; Blended
                 polyimide precursors; chain orientation; Chain
                 orientation; Cu; dimples; Dimples; discontinuous
                 ordered skin; Discontinuous ordered skin; improved
                 adhesion; Improved adhesion; metal-polymer adhesion;
                 Metal-polymer adhesion; morphology; morphology
                 tailoring; Morphology tailoring; mounds; Mounds;
                 nanoscale dimensions; Nanoscale dimensions;
                 nanotechnology; phase; Phase separation;
                 poly(pyromellitic dianhydride-oxydianiline);
                 Poly(pyromellitic dianhydride-oxydianiline); polyimide;
                 Polyimide; polymer blends; polymer structure; polymers;
                 roughening; semiflexible polyimides; Semiflexible
                 polyimides; separation; spontaneous; Spontaneous
                 roughening; surface; surface heterogeneities; Surface
                 heterogeneities; Surface morphology; surface
                 topography; surface treatment",
  thesaurus =    "Adhesion; Nanotechnology; Polymer blends; Polymer
                 structure; Polymers; Surface topography; Surface
                 treatment",
  treatment =    "X Experimental",
}

@Article{Lee:1994:WPS,
  author =       "K. W. Lee and A. Viehbeck",
  title =        "Wet-process surface modification of dielectric
                 polymers: {Adhesion} enhancement and metallization",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "457--474",
  month =        jul,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html#nine",
  abstract =     "For many electronic applications, the surface of a
                 dielectric polymer must be modified to obtain the
                 desired surface properties, such as wetting, adhesion,
                 and moisture barrier, without altering the bulk
                 properties. This paper reviews wet- process
                 modifications of dielectric polymer surfaces and also
                 presents unpublished results related to fluorinated
                 polyimides. In a typical wet process, a substrate is
                 immersed in or sprayed with a chemical solution, rinsed
                 with a solvent to remove the excess reagents, and then
                 dried if necessary. Wet processing can provide greatly
                 enhanced adhesion and reliability of the adherate (top)
                 layer to the modified polymer surface (adherend). We
                 discuss (a) the wet-process modification of various
                 polymers (e.g., PMDA-ODA, BPDA-PDA, 6FDA-ODA, PTFE,
                 PCTFE); (b) polyimide/polyimide and PCTFE/glass
                 adhesion, and (c) the surface chemistry and the
                 adhesion at a fluorinated polyimide (6FDA-ODA) surface.
                 Entanglement of polymer chains plays an important role
                 in polyimide/polyimide adhesion, while chemical
                 reactions are the major contributors to PCTFE/glass
                 adhesion strength. The metallization of dielectric
                 substrates often requires surface pretreatments or
                 conditioning by wet processes to sensitize a polymer
                 surface for deposition of a metal seed layer. After
                 seeding, a thick layer of a conducting metal (e.g., Cu)
                 is deposited by electroless or electrolytic plating.
                 Unlike dry or high-vacuum processing of polymer
                 surfaces, the chemistry of a wet-processed polymer
                 surface can be well charac- terized and often defined
                 at a molecular level. A relationship can be established
                 between a polymer's surface chemical (or morphological)
                 structure and its surface properties such as adhesion
                 and metallization.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Res. Div., Thomas J. Watson Res. Center",
  chemicalindex = "Cu/int Cu/el",
  classcodes =   "A8160J (Surface treatment and degradation of polymers
                 and plastics); A8190 (Other topics in materials
                 science); A6820 (Solid surface structure); A6140K
                 (Structure of polymers, elastomers, and plastics);
                 A0130R (Reviews and tutorial papers; resource letters);
                 B0560 (Polymers and plastics (engineering materials
                 science)); B2550E (Surface treatment for semiconductor
                 devices); B2550F (Metallisation and interconnection
                 technology)",
  classification = "A0130R (Reviews and tutorial papers; A6140K
                 (Structure of polymers, elastomers, and plastics);
                 A6820 (Solid surface structure); A8160J (Surface
                 treatment and degradation of polymers and plastics);
                 A8190 (Other topics in materials science); B0560
                 (Polymers and plastics (engineering materials
                 science)); B2550E (Surface treatment for semiconductor
                 devices); B2550F (Metallisation and interconnection
                 technology); resource letters)",
  corpsource =   "IBM Res. Div., Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; Adhesion enhancement; Cu; dielectric
                 polymers; Dielectric polymers; enhancement; Fluorinated
                 polyimides; fluorinated polyimides; metallisation;
                 metallization; Metallization; PCTFE/glass; PCTFE/glass
                 adhesion; polyimide/polyimide; Polyimide/polyimide;
                 polymer blends; polymer structure; polymers; reviews;
                 surface chemistry; Surface chemistry; Surface
                 modification; surface modification; surface
                 pretreatments; Surface pretreatments; surface
                 topography; surface treatment; wet-process
                 modifications; Wet-process modifications",
  thesaurus =    "Adhesion; Metallisation; Polymer blends; Polymer
                 structure; Polymers; Reviews; Surface topography;
                 Surface treatment",
  treatment =    "G General Review",
}

@Article{Hester:1994:PPP,
  author =       "P. D. Hester and W. J. Filip",
  title =        "Preface: {Power2} and {PowerPC} Architecture and
                 Implementation",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "490--491",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#one",
  abstract =     "During the four years since the RISC System\slash
                 6000* (RS\slash 6000) announcement in February of 1990,
                 IBM* has strengthened its product line with
                 microprocessor enhancements, increased memory capacity,
                 improved graphics, greatly expanded I/O adapters, and
                 new AIX* and compiler releases. In 1991, IBM began
                 planning for future RS\slash 6000 systems that would
                 span the range from small, battery-operated products to
                 very large supercomputers and mainframes. As the first
                 step toward achieving this ``palmtop to teraFLOPS''
                 goal with a single architecture, IBM investigated
                 further optimizations for the original POWER
                 Architecture*. This effort led to the creation of the
                 PowerPC* alliance (IBM Corporation, Motorola*, Inc.,
                 and Apple* Computer Corporation) and the definition of
                 the PowerPC Architecture*. Today, the single-chip
                 PowerPC 601* processor is the basis of IBM's entry
                 systems. A more aggressively superscalar version of the
                 original POWER processor, the multichip POWER2*
                 processor, is exploited in our current IBM high-end
                 RISC systems. As technology continues to advance,
                 PowerPC implementations will provide the basis for
                 high-performance 64-bit super servers. This special
                 issue of the IBM Journal of Research and Development
                 focuses on the POWER2 and PowerPC portions of IBM's
                 wide-ranging announcement in the Fall of 1993. The new
                 POWER2 processor nearly doubles the performance of the
                 earlier high-end models. The PowerPC 601 processor was
                 introduced in the RISC System\slash 6000 Model 250, the
                 first system in the industry to use the PowerPC
                 Architecture created by the strategic
                 IBM/Motorola/Apple alliance. These workstations
                 achieved industry-leading performance and
                 price/performance on virtually every industry-standard
                 benchmark, including SPECint92*, SPECfp92*, Linpack,
                 TPP, TPC-A*, and TPC-C*. Compared to the 1990
                 offerings, SPEC performance nearly quadrupled,
                 transaction performance improved by a factor of almost
                 five, maximum memory capacity quadrupled, and the
                 maximum disk capacity grew by an order of magnitude.
                 The POWER2 design exploits both multichip technology
                 and a larger die size to execute up to six instructions
                 (eight operations) per clock cycle. Many of the
                 higher-performance POWER2-based systems provide peak
                 execution rates in excess of a half billion operations
                 per second. The paper by White and Dhawan provides an
                 overview of the POWER2 design. Shippy and Griffith
                 describe the dual fixed-point unit design, the data
                 cache unit, and the storage control unit. Hicks, Fry,
                 and Harvey describe the dual floating-point unit
                 design. Barreh et al. describe hardware strategies to
                 minimize compare-branch penalties in the instruction
                 cache unit. Welbon et al. describe a POWER2 hardware
                 performance- monitoring facility which provides
                 execution characteristics that can identify
                 opportunities for application performance improvement.
                 This facility can also be used to gather information
                 crucial to future design decisions. Two performance
                 papers conclude the POWER2 portion of this issue.
                 Franklin et al. analyze some of the key POWER2 hardware
                 contributions to performance on the commercial
                 workloads. Agarwal, Gustavson, and Zubair relate their
                 experiences with optimizing the high-performance
                 Engineering/Scientific Subroutine Library (ESSL) for
                 the POWER2 implementation. While POWER2 and PowerPC
                 implementations provide the opportunity for
                 high-performance systems, optimizing software is also
                 key in delivering end-user performance. Blainey
                 describes aspects of the TOBEY compiler, with special
                 emphasis on instruction scheduling for the RS\slash
                 6000 products. Heisch describes TDPR, a prototype
                 version of FDPR, a program restructuring tool which
                 improves application performance by placing frequently
                 executed code blocks so as to minimize instruction
                 cache misses and branch penalties. IBM and the PowerPC
                 alliance are currently developing a family of five
                 PowerPC designs. IBM and Motorola designers at the
                 Somerset Design Center in Austin will optimize
                 single-chip implementations of the PowerPC Architecture
                 for high-volume products. The high-end requirements of
                 the large server and workstation products will be
                 addressed with multichip PowerPC implementations from
                 IBM. \par

                 IBM entry-level workstation products introduced the
                 PowerPC 601 microprocessor, the first member of the
                 PowerPC family. The goal for the PowerPC 601 designers
                 was to quickly bring PowerPC to the market. Vaden et
                 al. describe the microarchitecture and performance
                 aspects of the PowerPC 601 processor. Brodnax et al.
                 discuss the PowerPC 601 circuitry and chip
                 implementation details. Future products are planned
                 that will incorporate the PowerPC 603*, PowerPC 604*,
                 and the 64-bit PowerPC 620* implementations as they
                 become available. In addition, the price and
                 price/performance of the PowerPC family enable
                 lower-cost ``RISC PCs'' to be built using PowerPC
                 microprocessors. These ``RISC PCs'' will be developed
                 by the IBM POWER Personal Systems Division. \par

                 The PowerPC and POWER2 systems signify a major
                 milestone in IBM's commitment to the ``palmtops to
                 teraFLOPS'' strategy. The PowerPC 601 chip extends the
                 entry products further into the high-volume market by
                 providing exceptional performance in a low-cost
                 single-chip microprocessor. The high-end POWER2
                 implementation extracts the maximum performance
                 achievable in today's technology, thrusting the IBM
                 RISC processors into the supercomputing and
                 large-server environments. IBM POWER Parallel Systems
                 extends the RS\slash 6000 processing capability by
                 providing IBM POWER Parallel SP2* systems with up to
                 512 POWER/POWER2 nodes. In addition to scalability,
                 four-way High Availability Cluster Multi-Processor
                 (HACMP) systems provide the reliability/availability
                 that one would expect from mainframe-class systems by
                 supporting a ``no single point of failure'' capability,
                 even when one processor is off line. This impressive
                 base of processing technology complements a commitment
                 to high-performance compilers and strong graphics
                 offerings. \par

                 This robust product line addresses the cost-driven
                 requirements of the entry workstation market, the
                 transaction and server requirements of the commercial
                 market, and the computation-intensive requirements of
                 the technical market. These hardware offerings result
                 from a team effort by many dedicated and talented
                 individuals from around the world. Their expertise and
                 skill in a wide range of disciplines were key to
                 achieving this significant step toward the goal of a
                 comprehensive architecture. We want to thank all those
                 involved in continuing the success of the RISC
                 System\slash 6000 line.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{White:1994:PNG,
  author =       "S. W. White and S. Dhawan",
  title =        "{POWER2}: {Next} generation of the {RISC System\slash
                 6000} family",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "493--502",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#two",
  abstract =     "Since its announcement, the IBM RISC System\slash
                 6000* processor has characterized the aggressive
                 instruction-level parallelism approach to achieving
                 performance. Recent enhancements to the architecture
                 and implementation provide greater superscalar
                 capability. This paper describes the architectural
                 extensions which improve storage reference bandwidth,
                 allow hardware square-root computation, and speed
                 floating-point-to-integer conversion. The
                 implementation, which exploits these extensions and
                 doubles the number of functional units, is also
                 described. A comparison of performance results on a
                 variety of industry standard benchmarks demonstrates
                 that superscalar capabilities are an attractive
                 alternative to aggressive clock rates.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220P (Parallel architecture);
                 C5470 (Performance evaluation and testing)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220P (Parallel architecture);
                 C5470 (Performance evaluation and testing)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bandwidth; evaluation; floating-point-to-;
                 Floating-point-to-integer conversion;
                 Floating-point-to-integer conversion, POWER2; IBM RISC
                 System/6000 processor; IBM RISC System\slash 6000
                 processor; instruction-level; Instruction-level
                 parallelism; integer conversion; microprocessor chips;
                 parallel architectures; parallelism; performance;
                 POWER2; reduced instruction set computing; Square-root
                 computation; square-root computation; storage
                 reference; Storage reference bandwidth; superscalar
                 capability; Superscalar capability",
  thesaurus =    "Microprocessor chips; Parallel architectures;
                 Performance evaluation; Reduced instruction set
                 computing",
  treatment =    "P Practical",
}

@Article{Shippy:1994:PFD,
  author =       "D. J. Shippy and T. W. Griffith",
  title =        "{POWER2} fixed-point, data cache, and storage control
                 units",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "503--524",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#three",
  abstract =     "The POWER2* fixed-point, data cache, and storage
                 control units provide a tightly integrated subunit for
                 a second-generation high-performance superscalar RISC
                 processor. These functional units provide dual
                 fixed-point execution units and a large multiported
                 data cache, as well as high-performance interfaces to
                 memory, I/O, and the other execution units in the
                 processor. These units provide the following features:
                 dual fixed-point execution units, improved
                 fixed-point/floating-point synchronization, new
                 floating-point load and store quadword instructions,
                 improved address translation, improved fixed-point
                 multiply/divide, large multiported D-cache, increased
                 bandwidth into and out of the caches through wider data
                 buses, an improved external interrupt mechanism, and an
                 improved I/O DMA mechanism to support
                 multiple-streaming Micro Channels.*",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5470 (Performance evaluation
                 and testing); C5610S (System buses); C5320G
                 (Semiconductor storage)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5320G (Semiconductor storage);
                 C5470 (Performance evaluation and testing); C5610S
                 (System buses)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "address translation; Address translation; cache; cache
                 storage; data buses; Data buses; data cache; Data
                 cache; dual fixed-point; Dual fixed-point execution
                 units; execution units; external interrupt; External
                 interrupt mechanism; floating-; Floating-point;
                 mechanism; memory interface; Memory interface;
                 microprocessor chips; multiple-streaming micro
                 channels; Multiple-streaming micro channels;
                 multiported data; Multiported data cache; performance
                 evaluation; point; POWER2; reduced instruction set
                 computing; storage control units; Storage control
                 units; storage management; superscalar RISC processor;
                 Superscalar RISC processor; synchronisation;
                 synchronization; Synchronization; system buses",
  thesaurus =    "Cache storage; Microprocessor chips; Performance
                 evaluation; Reduced instruction set computing; Storage
                 management; Synchronisation; System buses",
  treatment =    "P Practical",
}

@Article{Hicks:1994:PFU,
  author =       "T. N. Hicks and R. E. Fry and P. E. Harvey",
  title =        "{POWER2} floating-point unit: {Architecture} and
                 implementation",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "525--536",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#four",
  abstract =     "The POWER2* floating-point unit (FPU) extends the
                 concept of the innovative multiply-add fused (MAF) ALU
                 of the RISC System\slash 6000* processor to provide a
                 floating-point unit that sets new standards, not only
                 for computation capability but for data throughput and
                 processor flexibility. The POWER2 FPU achieves a
                 performance (MFLOPS) rate never accomplished before by
                 a personal workstation machine by (1) integrating dual
                 generic MAF ALUs, (2) doubling the instruction
                 bandwidth and quadrupling the data bandwidth over that
                 of the POWER FPU, (3) adding support for additional
                 functions, and (4) using dynamic instruction scheduling
                 techniques to maximize instruction-level parallelism
                 not only among its own internal units but with the rest
                 of the CPU.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220P (Parallel architecture);
                 C5230 (Digital arithmetic methods)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5220P (Parallel architecture);
                 C5230 (Digital arithmetic methods)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architectures; bandwidth; computing; Data bandwidth;
                 data bandwidth; Dynamic instruction scheduling; dynamic
                 instruction scheduling; floating point arithmetic;
                 floating-point unit; Floating-point unit; instruction;
                 Instruction bandwidth; Instruction-level parallelism;
                 instruction-level parallelism; Instruction-level
                 parallelism, POWER2; microprocessor chips; multiply add
                 fused arithmetic logic unit; Multiply add fused
                 arithmetic logic unit; parallel; parallel processing;
                 POWER2; reduced instruction set; RISC System/6000
                 processor; RISC System\slash 6000 processor",
  thesaurus =    "Floating point arithmetic; Microprocessor chips;
                 Parallel architectures; Parallel processing; Reduced
                 instruction set computing",
  treatment =    "P Practical",
}

@Article{Barreh:1994:PIC,
  author =       "J. I. Barreh and R. T. Golla and L. B. Arimilli and P.
                 J. Jordan",
  title =        "{POWER2} instruction cache unit",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "537--544",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#five",
  abstract =     "This paper describes the instruction cache unit (ICU)
                 of the IBM POWER2 processor, with emphasis on
                 improvements over the original POWER ICU design. The
                 POWERS ICU incorporates a new compare-branch scheme
                 that minimizes processing time penalties, a second
                 branch processor, increased branch look-ahead
                 capability, and doubled instruction-fetch and
                 instruction-dispatch bandwidth.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5320G (Semiconductor
                 storage)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5320G (Semiconductor
                 storage)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "branch; Branch look-ahead capability; branch
                 processor; Branch processor; cache storage;
                 compare-branch scheme; Compare-branch scheme; IBM RISC
                 System/6000; IBM RISC System/6000 processor;
                 instruction cache unit; Instruction cache unit;
                 instruction sets; instruction-dispatch bandwidth;
                 Instruction-dispatch bandwidth; instruction-fetch
                 bandwidth; Instruction-fetch bandwidth; look-ahead
                 capability; microprocessor chips; POWER2; processor;
                 reduced instruction set computing",
  thesaurus =    "Cache storage; Instruction sets; Microprocessor chips;
                 Reduced instruction set computing",
  treatment =    "P Practical",
}

@Article{Welbon:1994:PPM,
  author =       "E. H. Welbon and C. C. Chan-Nui and D. J. Shippy and
                 D. A. Hicks",
  title =        "The {POWER2} performance monitor",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "545--554",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#six",
  abstract =     "The POWER2* performance monitor (``monitor'') provides
                 the detailed hardware measurements necessary to study
                 the hardware/software interactions of workloads
                 executed by the POWER2 processor. The monitor is
                 integrated into the processor and is fully software
                 accessible. Of interest is the ability of this monitor
                 to selectively measure specific software processes with
                 minimal perturbation of those processes.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5470 (Performance evaluation
                 and testing)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5470 (Performance evaluation
                 and testing)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "hardware measurements; Hardware measurements;
                 hardware/software interactions; Hardware/software
                 interactions; IBM RISC System/6000; IBM RISC
                 System/6000 processor; instruction set computing;
                 microprocessor chips; performance evaluation;
                 performance monitor; Performance monitor; POWER2;
                 processor; reduced",
  thesaurus =    "Microprocessor chips; Performance evaluation; Reduced
                 instruction set computing",
  treatment =    "T Theoretical or Mathematical",
}

@Article{Franklin:1994:CWP,
  author =       "M. T. Franklin and W. P. Alexander and R. Jauhari and
                 A. M. G. Maynard and B. R. Olszewski",
  title =        "Commercial workload performance in the {IBM POWER2
                 RISC System\slash 6000} processor",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "555--561",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#seven",
  abstract =     "We describe features of the POWER2* processor and
                 memory subsystem that enhance RISC System\slash 6000*
                 performance of commercial workloads. We explain the
                 performance characteristics of commercial workloads and
                 some of the common benchmarks used to measure them. Our
                 own analysis methods are also described.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "C5430 (Microcomputers); C6140B (Machine-oriented
                 languages); C5310 (Storage system design); C6120 (File
                 organisation); C5220 (Computer architecture); C5470
                 (Performance evaluation and testing)",
  classification = "C5220 (Computer architecture); C5310 (Storage system
                 design); C5430 (Microcomputers); C5470 (Performance
                 evaluation and testing); C6120 (File organisation);
                 C6140B (Machine-oriented languages)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "benchmarks; Benchmarks; commercial workload
                 performance; Commercial workload performance; IBM
                 computers; IBM POWER2 RISC System/6000; IBM POWER2 RISC
                 System/6000 processor; memory architecture; memory
                 subsystem; Memory subsystem; performance
                 characteristics; Performance characteristics;
                 performance evaluation; processor; reduced instruction
                 set computing; RISC System/6000 performance",
  thesaurus =    "IBM computers; Memory architecture; Performance
                 evaluation; Reduced instruction set computing",
  treatment =    "P Practical; R Product Review",
}

@Article{Agarwal:1994:EFP,
  author =       "R. C. Agarwal and F. G. Gustavson and M. Zubair",
  title =        "Exploiting functional parallelism of {POWER2} to
                 design high-performance numerical algorithms",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "563--576",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#eight",
  abstract =     "We describe the algorithms and architecture approach
                 to produce high-performance codes for numerically
                 intensive computations. In this approach, for a given
                 computation, we design algorithms so that they perform
                 optimally when run on a target machine --- in this
                 case, the new POWER2* machines from the RS\slash 6000
                 family of RISC processors. The algorithmic features
                 that we emphasize are functional parallelism,
                 cache/register blocking, algorithmic prefetching, loop
                 unrolling, and algorithmic restructuring. The
                 architectural features of the POWER2 machine that we
                 describe and that lead to high performance are multiple
                 functional units, high bandwidth between registers,
                 cache, and memory, a large number of fixed- and
                 floating-point registers, and a large cache and TLB
                 (translation lookaside buffer). The paper gives two
                 examples that illustrate how the algorithms and
                 architectural features interplay to produce
                 high-performance codes. They are BLAS (basic linear
                 algebra subroutines) and narrow-band matrix routines.
                 These routines are included in ESSL (Engineering and
                 Scientific Subroutine Library); an overview of ESSL is
                 also given in this paper.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "C7310 (Mathematics computing); C5430 (Microcomputers);
                 C6140B (Machine-oriented languages); C6110P (Parallel
                 programming)",
  classification = "C5430 (Microcomputers); C6110P (Parallel
                 programming); C6140B (Machine-oriented languages);
                 C7310 (Mathematics computing)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithmic; Algorithmic prefetching; algorithmic
                 restructuring; Algorithmic restructuring; algorithms;
                 and Scientific Subroutine Library; basic linear
                 algebra; Basic linear algebra subroutines; BLAS;
                 cache/register blocking; Cache/register blocking;
                 computations; Engineering; Engineering and Scientific
                 Subroutine Library; ESSL; floating-point registers;
                 Floating-point registers; functional parallelism;
                 Functional parallelism; high-performance codes;
                 High-performance codes; high-performance numerical;
                 High-performance numerical algorithms; IBM computers;
                 loop unrolling; Loop unrolling; mathematics computing;
                 multiple functional units; Multiple functional units;
                 narrow-band matrix routines; Narrow-band matrix
                 routines; numerically intensive; Numerically intensive
                 computations; parallel algorithms; POWER2 workstations;
                 prefetching; processors; reduced instruction set
                 computing; RISC; RISC processors; RS/6000 family;
                 software libraries; subroutines; translation lookaside
                 buffer; Translation lookaside buffer; workstations",
  thesaurus =    "IBM computers; Mathematics computing; Parallel
                 algorithms; Reduced instruction set computing; Software
                 libraries; Workstations",
  treatment =    "P Practical",
}

@Article{Blainey:1994:IST,
  author =       "R. J. Blainey",
  title =        "Instruction scheduling in the {TOBEY} compiler",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "577--593",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#nine",
  abstract =     "The high performance of pipelined, superscalar
                 processors such as the POWER2* and PowerPC* is achieved
                 in large part through the parallel execution of
                 instructions. This fine-grain parallelism cannot always
                 be achieved by the processor alone, but relies to some
                 extent on the ordering of the instructions in a
                 program. This dependence implies that optimizing
                 compilers for these processors must generate or
                 schedule the instructions in an order that maximizes
                 the possible parallelism. This paper describes the
                 parts of the TOBEY compiler which address the
                 instruction scheduling issue.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Canada Ltd., Toronto, Ont., Canada",
  classcodes =   "C6150C (Compilers, interpreters and other processors);
                 C6110P (Parallel programming); C5220P (Parallel
                 architecture)C5430 (Microcomputers)",
  classification = "C5220P (Parallel architecture); C5430
                 (Microcomputers); C6110P (Parallel programming); C6150C
                 (Compilers, interpreters and other processors)",
  corpsource =   "IBM Canada Ltd., Toronto, Ont., Canada",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "fine-grain parallelism; Fine-grain parallelism; IBM
                 computers; instruction scheduling; Instruction
                 scheduling; optimising compilers; optimizing compilers;
                 Optimizing compilers; parallel execution; Parallel
                 execution; parallel programming; pipeline processing;
                 pipelined; Pipelined superscalar processors; POWER2;
                 PowerPC; scheduling; superscalar processors; TOBEY
                 compiler; workstations",
  thesaurus =    "IBM computers; Optimising compilers; Parallel
                 programming; Pipeline processing; Scheduling;
                 Workstations",
  treatment =    "P Practical",
}

@Article{Heisch:1994:TPR,
  author =       "R. R. Heisch",
  title =        "Trace-directed program restructuring for {AIX}
                 executables",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "595--603",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#ten",
  abstract =     "This paper presents the design and implementation of
                 trace-directed program restructuring (TDPR) for AIX*
                 executable programs. TDPR is the process of reordering
                 the instructions in an executable program, using an
                 actual execution profile (or instruction address trace)
                 for a selected workload, to improve utilization of the
                 existing hardware architecture. Generally, the
                 application of TDPR results in faster programs,
                 programs that use less real memory, or both. Previous
                 similar work regarding profile-guided or
                 feedback-directed program optimization has demonstrated
                 significant improvements for various architectures.
                 TDPR applies these concepts to AIX executable programs
                 at a global level (i.e., independent of procedure or
                 other structural boundaries) running on the POWER,
                 POWER2*, and PowerPC 601* machines and adds the
                 methodology to preserve correctness and debuggability
                 for reordered executables. Using the prototype tools
                 developed for this effort on a selection of both
                 user-level application programs and operating system
                 (kernel) code, improvements in execution time of up to
                 73\% and reduced instruction memory requirements of up
                 to 61\% were measured. The techniques used to
                 restructure AIX executables are discussed, and the
                 performance improvements and memory reductions measured
                 for several application programs are presented.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "C6150G (Diagnostic, testing, debugging and evaluating
                 systems); C6150C (Compilers, interpreters and other
                 processors); C5430 (Microcomputers); C5220 (Computer
                 architecture); C6120 (File organisation)",
  classification = "C5220 (Computer architecture); C5430
                 (Microcomputers); C6120 (File organisation); C6150C
                 (Compilers, interpreters and other processors); C6150G
                 (Diagnostic, testing, debugging and evaluating
                 systems)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AIX executables; architecture; correctness;
                 Correctness; debuggability; Debuggability; execution
                 profile; Execution profile; feedback-directed program
                 optimization; Feedback-directed program optimization;
                 global; Global level; hardware; Hardware architecture;
                 IBM computers; instruction address trace; Instruction
                 address trace; instruction memory requirements;
                 Instruction memory requirements; instruction sets;
                 kernel code; Kernel code; level; optimising compilers;
                 POWER; POWER2; PowerPC 601 machines; program
                 diagnostics; storage management; trace-directed program
                 restructuring; Trace-directed program restructuring;
                 user-level application programs; User-level application
                 programs; workstations",
  thesaurus =    "IBM computers; Instruction sets; Optimising compilers;
                 Program diagnostics; Storage management; Workstations",
  treatment =    "P Practical",
}

@Article{Vaden:1994:DCP,
  author =       "M. T. Vaden and L. J. Merkel and C. R. Moore and T. M.
                 Potter and R. J. Reese",
  title =        "Design considerations for the {PowerPC} 601
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "605--620",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#eleven",
  abstract =     "The PowerPC 601* microprocessor (601) is the first
                 member of a family of processors that support IBM's
                 PowerPC Architecture*. The 601 is a general-purpose
                 processor based on a superscalar design point. As with
                 any development effort, the 601 development program had
                 several different, often conflicting, design goals. The
                 most important requirements were support for the
                 PowerPC Architecture, a short development cycle,
                 competitive performance and cost, compatibility with
                 existing POWER applications, and support for
                 multiprocessing. This paper describes several aspects
                 of the 601 design and discusses some of the design
                 trade-offs considered in those areas.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "C5430 (Microcomputers); C5440 (Multiprocessing
                 systems); C5220P (Parallel architecture)",
  classification = "C5220P (Parallel architecture); C5430
                 (Microcomputers); C5440 (Multiprocessing systems)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "architectures; competitive performance; Competitive
                 performance; design considerations; Design
                 considerations; design point; general-purpose
                 processor; General-purpose processor; IBM; IBM
                 computers; IBM PowerPC Architecture; multiprocessing;
                 Multiprocessing; multiprocessing systems; parallel;
                 PowerPC 601 microprocessor; PowerPC Architecture;
                 superscalar; Superscalar design point; workstations",
  thesaurus =    "IBM computers; Multiprocessing systems; Parallel
                 architectures; Workstations",
  treatment =    "P Practical; R Product Review",
}

@Article{Brodnax:1994:IPM,
  author =       "T. B. Brodnax and R. V. Billings and S. C. Glenn and
                 P. T. Patel",
  title =        "Implementation of the {PowerPC} 601 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "621--632",
  month =        sep,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html#twelve",
  abstract =     "To produce a marketable PowerPC* microprocessor on a
                 short development schedule, the logic had to be
                 designed in a manner flexible enough to allow quick
                 modifications without sacrificing high performance and
                 density when customized cells were required. This was
                 accomplished for the PowerPC 601* microprocessor (601)
                 with a high-level design-language description, which
                 was synthesized for a gate-level implementation and
                 simulated for functional verification. In a similar
                 way, the physical design strategy for the 601 struck an
                 attractive balance between a highly automated, flexible
                 floorplan and the additional density that had to be
                 available for limited, well-conceived manual
                 placements. Finally, a rigorous test strategy was
                 implemented, which has proved very useful in analyzing
                 the processor and in assembling 601-based systems.
                 Careful adherence to this methodology led to a
                 successful first-pass physical implementation, leaving
                 the second iteration for additional customer
                 requests.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Corp., Austin, TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips)",
  classification = "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips)",
  corpsource =   "IBM Corp., Austin, TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "description; flexible floorplan; Flexible floorplan;
                 functional; Functional verification; gate-level
                 implementation; Gate-level implementation; high-level
                 design-language; High-level design-language
                 description; IBM computers; microprocessor chips;
                 PowerPC 601 microprocessor; rigorous test strategy;
                 Rigorous test strategy; verification",
  thesaurus =    "IBM computers; Microprocessor chips",
  treatment =    "P Practical",
}

@Article{Anonymous:1994:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "633--639",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Aug 29 08:42:18 1994",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1994:RIPe,
  author =       "Anonymous",
  title =        "Recent {IBM} patents",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "5",
  pages =        "641--648",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Dec 09 17:22:32 1995",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-5.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boudreau:1994:PCR,
  author =       "P. E. Boudreau and W. C. Bergman and D. R. Irvin",
  title =        "Performance of a cyclic redundancy check and its
                 interaction with a data scrambler",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "651--658",
  month =        nov,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html#one",
  abstract =     "This paper covers four topics: (1) the operation and
                 performance of cyclic redundancy checks (CRCs); (2) the
                 shortest error patterns of various weights that are
                 undetectable by the ANSI/IEEE-standard 32-bit CRC
                 (CRC32); (3) the general interaction of data scramblers
                 with CRCs; and (4) the specific problems that arise in
                 ATM communication due to the interaction of the
                 scrambler with the degree-10 CRC polynomial (CRC10).
                 Elaborating (4), we explore the virtues of replacing
                 CRC10 with CRC32 or with a degree-10 polynomial (P2055)
                 that has no factors in common with the scrambler.
                 Extensive results are presented concerning the
                 capability of CRC10, P2055, and CRC32 to detect various
                 error patterns.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6230 (Switching centres and equipment); B6150C
                 (Communication switching); B6120B (Codes); C5670
                 (Network performance); C5470 (Performance evaluation
                 and testing)",
  classification = "B6120B (Codes); B6150C (Communication switching);
                 B6230 (Switching centres and equipment); C5470
                 (Performance evaluation and testing); C5670 (Network
                 performance)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ANSI; asynchronous transfer mode; ATM; ATM
                 communication; communication; cyclic codes; cyclic
                 redundancy check; Cyclic redundancy check; data
                 scrambler; Data scrambler; evaluation; IEEE-standard;
                 performance; Performance; shortest error patterns;
                 Shortest error patterns",
  thesaurus =    "Asynchronous transfer mode; Cyclic codes; Performance
                 evaluation",
  treatment =    "P Practical",
}

@Article{Deutsch:1994:PLE,
  author =       "A. Deutsch and G. Arjavalingam and C. W. Surovic and
                 A. P. Lanzetta and K. E. Fogel and F. Doany and M.
                 Ritter",
  title =        "Performance limits of electrical cables for
                 intrasystem communication",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "659--672",
  month =        nov,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html#two",
  abstract =     "Three types of cables (commercially available
                 high-performance coaxial and ribbon cables, and an
                 experimental flexible-film cable) were investigated for
                 intrasystem communication in high-performance computer
                 and communication systems. The electrical properties of
                 the cables and their respective connectors were
                 obtained and compared through the use of time-domain
                 techniques. Feasibility for use in digital signal
                 propagation at 500 Mb/s --- 1 Gb/s was demonstrated by
                 means of pulse propagation and eye-diagram
                 measurements. Performance limits in terms of maximum
                 useful cable lengths were determined through
                 simulations which included the effects of associated
                 connectors, vias, and printed-circuit-card wiring.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "B6240D (Waveguide and coaxial cable systems); B6210L
                 (Computer communications); C5620 (Computer networks and
                 techniques)",
  classification = "B6210L (Computer communications); B6240D (Waveguide
                 and coaxial cable systems); C5620 (Computer networks
                 and techniques)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "coaxial cable; Coaxial cable; coaxial cables;
                 communication; computer networks; electrical cables;
                 Electrical cables; electrical properties; Electrical
                 properties; eye-diagram measurements; Eye-diagram
                 measurements; flexible-film cable; Flexible-film cable;
                 intrasystem; Intrasystem communication; performance
                 limits; Performance limits; printed-circuit-card;
                 Printed-circuit-card wiring; propagation; pulse; Pulse
                 propagation; time-domain techniques; Time-domain
                 techniques; wiring",
  thesaurus =    "Coaxial cables; Computer networks",
  treatment =    "P Practical",
}

@Article{Agarwal:1994:HMA,
  author =       "R. C. Agarwal and F. G. Gustavson and M. Zubair",
  title =        "A high-performance matrix-multiplication algorithm on
                 a distributed-memory parallel computer, using
                 overlapped communication",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "673--681",
  month =        nov,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html#three",
  abstract =     "In this paper, we propose a scheme for matrix-matrix
                 multiplication on a distributed-memory parallel
                 computer. The scheme hides almost all of the
                 communication cost with the computation and uses the
                 standard, optimized Level-3 BLAS operation on each
                 node. As a result, the overall performance of the
                 scheme is nearly equal to the performance of the
                 Level-3 optimized BLAS operation times the number of
                 nodes in the computer, which is the peak performance
                 obtainable for parallel BLAS. Another feature of our
                 algorithm is that it can give peak performance for
                 larger matrices, even if the underlying communication
                 network of the computer is slow.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C7310 (Mathematics computing); C5440 (Multiprocessing
                 systems); C4140 (Linear algebra); C5470 (Performance
                 evaluation and testing)",
  classification = "C4140 (Linear algebra); C5440 (Multiprocessing
                 systems); C5470 (Performance evaluation and testing);
                 C7310 (Mathematics computing)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algebra; communication; Communication cost; cost;
                 distributed memory parallel computer; Distributed
                 memory parallel computer; distributed memory systems;
                 high-performance matrix-multiplication algorithm;
                 High-performance matrix-multiplication algorithm;
                 Level-3 BLAS operation; mathematics computing; matrix;
                 matrix-matrix multiplication; Matrix-matrix
                 multiplication; overlapped; Overlapped communication;
                 performance evaluation",
  thesaurus =    "Distributed memory systems; Mathematics computing;
                 Matrix algebra; Performance evaluation",
  treatment =    "A Application; P Practical",
}

@Article{Raghavan:1994:MVR,
  author =       "P. Raghavan and M. Snir",
  title =        "Memory versus randomization in on-line algorithms",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "683--707",
  month =        nov,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html#four",
  abstract =     "On-line algorithms service sequences of requests, one
                 at a time, without knowing future requests. We compare
                 their performance with the performance of algorithms
                 that generate the sequences and service them as well.
                 In many settings, on-line algorithms perform almost as
                 well as optimal off-line algorithms, by using
                 statistics about previous requests in the sequences.
                 Since remembering such information may be expensive, we
                 consider the use of randomization to eliminate memory.
                 In the process, we devise and study performance
                 measures for randomized on-line algorithms. We develop
                 and analyze memoryless randomized on-line algorithms
                 for the cacheing problem and its generalizations.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C4240 (Programming and algorithm theory); C6120 (File
                 organisation)",
  classification = "C4240 (Programming and algorithm theory); C6120
                 (File organisation)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "buffer circuits; cache storage; cacheing problem;
                 Cacheing problem; on-line algorithms; On-line
                 algorithms; optimal off-line algorithms; Optimal
                 off-line algorithms; performance; Performance;
                 randomised algorithms; randomization; Randomization;
                 sequences of requests; Sequences of requests",
  thesaurus =    "Buffer circuits; Cache storage; Randomised
                 algorithms",
  treatment =    "P Practical; T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:AIVa,
  author =       "Anonymous",
  title =        "Author index for Volume 37",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "??--??",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:AIVb,
  author =       "Anonymous",
  title =        "Author index for Volume 38",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "??--??",
  month =        jun,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:PRIa,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "??--??",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:PRIb,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "??--??",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:PRIc,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "??--??",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:PRId,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "??--??",
  month =        apr,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:PRIf,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "??--??",
  month =        jun,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RIPa,
  author =       "Anonymous",
  title =        "Recent {IBM} publications",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "??--??",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:43:09 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RIPc,
  author =       "Anonymous",
  title =        "Recent {IBM} publications",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "??--??",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:43:16 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RIPd,
  author =       "Anonymous",
  title =        "Recent {IBM} publications",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "??--??",
  month =        apr,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:43:20 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "3",
  pages =        "??--??",
  month =        mar,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "4",
  pages =        "??--??",
  month =        apr,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPe,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "??--??",
  month =        jun,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "??--??",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "2",
  pages =        "??--??",
  month =        feb,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "??--??",
  month =        jun,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:43:25 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:SIVa,
  author =       "Anonymous",
  title =        "Subject index for Volume 37",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "1",
  pages =        "??--??",
  month =        jan,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-1.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1994:SIVb,
  author =       "Anonymous",
  title =        "Subject index for Volume 38",
  journal =      j-IBM-JRD,
  volume =       "38",
  number =       "6",
  pages =        "??--??",
  month =        jun,
  year =         "1994",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 26 08:59:30 MST 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Fleming:1995:PIC,
  author =       "Daniel J. Fleming",
  title =        "Preface: {IBM CMOS} Technology",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "3--3",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#one",
  abstract =     "Within the past decade CMOS has become the technology
                 of choice for a broad range of semiconductor products.
                 High-density DRAMs, high-speed processors, and
                 low-power devices for mobile applications are key
                 examples. Underlying this widespread appeal are the
                 distinguishing advantages that CMOS provides: an
                 exceptionally low power-delay product, the ability to
                 accommodate millions of devices on a single chip, and
                 flexible, custom design methodologies which permit
                 optimization, as required, for lowest cost, lowest
                 power, or highest speed. Accompanying the versatility
                 of CMOS is the economy of providing support for a
                 single technology, rather than for a collection of
                 several disparate ones. This issue of the IBM Journal
                 of Research and Development is a collection of papers
                 on IBM CMOS technology which illustrates this breadth
                 of application and describes the increasing
                 sophistication that is present in the underlying design
                 tools and fabrication techniques. The opening papers,
                 by Sechler and Grohoski, describe the impact of CMOS on
                 the system design of high-performance processors such
                 as those used in IBM's RISC System\slash 6000
                 workstation family. Following these are several papers
                 describing chip designs which together demonstrate the
                 flexibility of CMOS in providing superior solutions to
                 applications that traditionally required much more
                 disparate supporting device technology. Included are
                 contributions by Bernstein et al., describing the
                 trade-off of power for performance in the IBM 601
                 PowerPC chip, and two papers which show the versatility
                 of CMOS DRAM cores surrounded by application-specific
                 circuitry. The first, by Sunaga et al., is on a
                 wide-I/O (64Kb x 32) chip for graphics applications;
                 the second, by Ellis et al., demonstrates the
                 flexibility in DRAM applications that can be offered to
                 system designers. The use of CMOS in applications at
                 the interface between technically conflicting signal
                 regimes, such as photonics and analog, is illustrated
                 in the next three papers, by Kuchta et al. on CMOS
                 photodetector/preamplifiers, by Ewen et al. on
                 CMOS-based custom circuits for high-speed data
                 communication, and by Shin et al. on the design of a
                 custom low-power, high-performance CMOS-based digital
                 signal-processing circuit. Closing the section on chip
                 design are a paper by Bechade and Houle, which presents
                 a technique for clock multiplication, and a paper by
                 Dhong et al., which describes a circuit for providing a
                 low-noise CMOS TTL-compatible off-chip driver. Design
                 automation tools have had to keep pace with the
                 increasing complexity and diversity of CMOS
                 applications, as described in the next three papers.
                 Bose and Surya present techniques for a structured
                 approach to timing verification in high-speed RISC
                 processors. Bergamaschi et al. describe a now
                 commercially available method for synthesizing
                 gate-level networks from a high-level functional
                 description. Kuehlman et al. describe a formal
                 verification program for confirming the equivalence of
                 CMOS transistor-level designs and their high-level
                 functional specification. Today's CMOS technology is
                 the result of several decades of evolution, illustrated
                 by the papers in the final section. Adler et al.
                 describe the influence provided by DRAMs in this
                 evolutionary process. Chesebro et al. discuss the
                 complexity of channel-length control across large
                 chips, an effect which can seriously limit chip
                 performance. The next two papers speak to the current
                 state of the production art: Leonovich et al. describe
                 the process by which a modern silicon production
                 facility learns, and Koburger et al. describe how the
                 base technology provided by DRAMs is extended to
                 provide the features needed for high-performance,
                 low-power logic applications at 2.5 volts. Finally, the
                 extendibility of CMOS is examined in two papers which
                 explore the fringes of today's capabilities: Shahidi et
                 al. take a look at the implications of providing a CMOS
                 technology which operates at 1 volt, and Taur et al.
                 show results recently realized in fabricating CMOS
                 transistors at channel lengths of 100 nm and less.
                 \par

                 This issue was brought together by the diligent effort
                 of the following individuals: Peter Cottrell, James
                 Dunn, J. Michael Hancock, Tak Ning, Rosemary
                 Previti-Kelly, W. David Pricer, Robert Sechler, and
                 Lewis Terman, who identified and solicited the papers
                 as well as many of the peer reviewers. We are grateful
                 as well to Karen Papo, who provided invaluable and
                 responsive administrative support. Finally, we
                 acknowledge all those who make up the IBM CMOS
                 technology team. Their contributions are, of necessity,
                 only partially represented by the papers in this issue.
                 \par

                 Daniel J. Fleming Guest Editor \par

                 Editor's note: The editors gratefully acknowledge the
                 leadership of guest editor Daniel Fleming in the
                 planning and development of this issue. Formerly
                 Director of Development for the IBM Microelectronics
                 Division and now retired from IBM, Dan identified and
                 recruited the steering committee, organized the subject
                 matter as he has described it above, obtained the
                 commitment and support of executive management, and
                 provided direction, motivation, and encouragement to
                 all of us.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxpages =      "3--4",
}

@Article{Sechler:1995:DAS,
  author =       "R. F. Sechler and G. F. Grohoski",
  title =        "Design at the system level with {VLSI CMOS}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "5--22",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#two",
  abstract =     "This paper explores high-performance central
                 processing unit (CPU) design with VLSI CMOS.
                 Workstations are the focus, because they were first to
                 apply the synergism of CMOS, VLSI, and
                 reduced-instruction-set computing (RISC). But the
                 advances of CMOS now encompass all computing system
                 design, and extend to newly created environments. We
                 discuss CMOS extendibility in the highest-performance
                 areas.",
  acknowledgement = ack-nhfb,
  affiliation =  "Syst. Technol. and Archit. Div., IBM Corp., Austin,
                 TX, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5130 (Microprocessor
                 chips); C5220 (Computer architecture)",
  classification = "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5130 (Microprocessor
                 chips); C5220 (Computer architecture)",
  corpsource =   "Syst. Technol. and Archit. Div., IBM Corp., Austin,
                 TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "CMOS digital integrated circuits; CMOS extendibility;
                 High-performance central processing unit;
                 high-performance central processing unit;
                 instruction-set computing; microprocessor chips;
                 reduced instruction set computing; reduced-;
                 Reduced-instruction-set computing; RISC; VLSI; VLSI
                 CMOS; workstations",
  thesaurus =    "CMOS digital integrated circuits; Microprocessor
                 chips; Reduced instruction set computing; VLSI;
                 Workstations",
  treatment =    "P Practical",
}

@Article{Sechler:1995:IDV,
  author =       "R. F. Sechler",
  title =        "Interconnect design with {VLSI CMOS}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "23--31",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#three",
  abstract =     "Historically, high-performance logic circuit interchip
                 design has focused on bipolar emitter-coupled logic
                 (ECL) circuits and signals, but VLSI CMOS has attained
                 performance levels at which problems unique to its
                 characteristics must be addressed for design
                 optimization. In this paper, CMOS interchip circuit
                 models are applied to develop packaging and wiring
                 constraints for synchronous communication.",
  acknowledgement = ack-nhfb,
  affiliation =  "Syst. Technol. and Archit. Div., IBM Corp., Austin,
                 TX, USA",
  classcodes =   "B2570D (CMOS integrated circuits); B2570A (Integrated
                 circuit modelling and process simulation); B1265B
                 (Logic circuits); B0170J (Product packaging)",
  classification = "B0170J (Product packaging); B1265B (Logic circuits);
                 B2570A (Integrated circuit modelling and process
                 simulation); B2570D (CMOS integrated circuits)",
  corpsource =   "Syst. Technol. and Archit. Div., IBM Corp., Austin,
                 TX, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "bipolar emitter-coupled logic; Bipolar emitter-coupled
                 logic circuits; circuit; circuits; CMOS interchip
                 circuit; CMOS interchip circuit models; CMOS logic
                 circuits; communication; Coupled lines; coupled lines;
                 Delays; delays; Design optimization; design
                 optimization; ECL; emitter-coupled logic;
                 high-performance logic; High-performance logic circuit;
                 integrated circuit design; integrated circuit
                 modelling; integrated circuit noise; integrated circuit
                 packaging; Interchip design; interchip design;
                 Interconnect design; interconnect design; models;
                 Noise; noise; Packaging; packaging; Reactive
                 reflections; reactive reflections; synchronous;
                 Synchronous communication; VLSI; VLSI CMOS; Wiring
                 constraints; wiring constraints",
  thesaurus =    "CMOS logic circuits; Delays; Emitter-coupled logic;
                 Integrated circuit design; Integrated circuit
                 modelling; Integrated circuit noise; Integrated circuit
                 packaging; VLSI",
  treatment =    "P Practical",
}

@Article{Bernstein:1995:RVP,
  author =       "K. Bernstein and J. E. Bertsch and L. G. Heller and E.
                 J. Nowak and F. R. White",
  title =        "Reduced voltage power\slash performance optimization
                 of the 3.6- volt {PowerPC} 601 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "33--42",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#four",
  abstract =     "An experimental 2.0-volt low-power PowerPC 601*
                 Microprocessor built in a modified 3.6-volt, 0.6-micron
                 IBM CMOS technology is described. By using unmodified
                 tasks from the 3.6-volt design, a 3x power savings was
                 realized while maintaining nearly the original
                 performance. The use of selective scaling provides high
                 performance at reduced power supply voltage. This
                 technique, applicable to selected existing product
                 designs, may allow early entry into the low-power
                 market while minimizing new process development
                 expense. The technique proposes hyperscaled reductions
                 in specific electrical and physical parameters, while
                 keeping horizontal layout rules unchanged. Static chip
                 designs, which comprise the majority of 601 circuitry,
                 respond well to the alterations. In addition, potential
                 reliability detractors are deuced or eliminated.
                 Challenges to this technique include I/O interfacing
                 and minimizing leakages associated with low device
                 thresholds. The 601 design and its base technology are
                 described, along with the experimental changes. The
                 paper reviews the motivation behind low-power
                 microprocessor development, alternative power-saving
                 techniques being practiced, and opportunities for
                 continued power reduction.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); B0170N (Reliability); C5130
                 (Microprocessor chips)",
  classification = "B0170N (Reliability); B1265F (Microprocessors and
                 microcomputers); B2570D (CMOS integrated circuits);
                 C5130 (Microprocessor chips)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.6 mum; 0.6 Mum; 3.6 V; 601 design; 601 Design;
                 circuit optimisation; CMOS digital integrated circuits;
                 horizontal layout; Horizontal layout; hyperscaled
                 reductions; Hyperscaled reductions; IBM; integrated
                 circuit design; integrated circuit reliability;
                 integrated circuit technology; masks; microprocessor
                 chips; power savings; Power savings; reduced power;
                 Reduced power supply voltage; reliability; Reliability;
                 selective scaling; Selective scaling; static chip
                 design; Static chip design; supply voltage; unmodified;
                 Unmodified masks; voltage power/performance
                 optimization; Voltage power/performance optimization",
  numericalindex = "Voltage 3.6E+00 V; Size 6.0E-07 m",
  thesaurus =    "Circuit optimisation; CMOS digital integrated
                 circuits; Integrated circuit design; Integrated circuit
                 reliability; Integrated circuit technology;
                 Microprocessor chips; Reliability",
  treatment =    "X Experimental; P Practical; R Product Review",
}

@Article{Sunaga:1995:DGA,
  author =       "T. Sunaga and K. Hosokawa and S. H. Dhong and K.
                 Kitamura",
  title =        "A {64Kb} $\times$ 32 {DRAM} for graphics
                 applications",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "43--50",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#five",
  abstract =     "A high-speed 2Mb CMOS DRAM with 32 data I/Os is
                 described. A 0.6-micron CMOS process with a single
                 polysilicon layer, two levels of metal, and
                 substrate-plate trench-capacitor (SPT) memory cells is
                 used to fabricate the chip. It is designed to provide
                 the wide data bandwidth required by high-performance
                 graphics applications. A 35-ns access time with an
                 80-ns cycle time has been demonstrated. The 32-bit data
                 bus and the high-speed feature achieve more than two
                 times better graphics performance than conventional
                 dual-port memories. A sensing method with a 2/3 VDD
                 bit-line precharge voltage and a limited bit-line
                 voltage swing is exploited to optimize speed and power.
                 The chip, which operates on a 5-V power supply,
                 dissipates 140 mA at the 80-ns cycle time.",
  acknowledgement = ack-nhfb,
  affiliation =  "Yasu Technol. Application Lab., IBM Japan Ltd., Yasu,
                 Japan",
  classcodes =   "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage); C5310
                 (Storage system design)C5540 (Terminals and graphic
                 displays)",
  classification = "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5310 (Storage system design); C5320G
                 (Semiconductor storage); C5540 (Terminals and graphic
                 displays)",
  corpsource =   "Yasu Technol. Application Lab., IBM Japan Ltd., Yasu,
                 Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "0.6 mum; 0.6 Mum; 140 mA; 140 MA; 32 bit; 32 Bit; 35
                 ns; 35 Ns; 5 V; 64 k; 64 K; bandwidth; chips; CMOS
                 DRAM; CMOS memory circuits; computer graphic equipment;
                 cycle time; Cycle time; DRAM; dual-port memories;
                 Dual-port memories; graphics; graphics applications;
                 Graphics applications; Graphics performance;
                 high-performance graphics; High-performance graphics;
                 integrated circuit technology; limited bit-; Limited
                 bit-line voltage; line voltage; memory architecture;
                 performance; polysilicon layer; Polysilicon layer;
                 sensing method; Sensing method; substrate-plate
                 trench-capacitor memory cells; Substrate-plate
                 trench-capacitor memory cells; wide data; Wide data
                 bandwidth",
  numericalindex = "Memory size 6.6E+04 Byte; Word length 3.2E+01 bit;
                 Size 6.0E-07 m; Time 3.5E-08 s; Voltage 5.0E+00 V;
                 Current 1.4E-01 A",
  thesaurus =    "CMOS memory circuits; Computer graphic equipment; DRAM
                 chips; Integrated circuit technology; Memory
                 architecture",
  treatment =    "A Application; P Practical",
}

@Article{Ellis:1995:MDA,
  author =       "W. F. Ellis and J. E. {Barth, Jr.} and S. Divakaruni
                 and J. H. Dreibelbis and A. Furman and E. L. Hedberg
                 and H. S. Lee and T. M. Maffitt and C. P. Miller and C.
                 H. Stapper and H. L. Kalter",
  title =        "Multipurpose {DRAM} architecture for optimal power,
                 performance, and product flexibility",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "51--62",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#six",
  abstract =     "An 18 Mb DRAM has been designed in a 3.3-V, 0.5-$\mu$m
                 CMOS process. The array consists of four independent,
                 self-contained 4.5 Mb quadrants. The chip output
                 configuration defaults to 1 Mb $\times$ 18 for
                 optimization of wafer screen tests, while 3.3-V or
                 5.0-V operation is selected by choosing one of two M2
                 configurations. Selection of 2 Mb $\times$ 9 or 1 Mb
                 $\times$ 18 operation with the various address options,
                 in extended data-out or fast-page mode, is accomplished
                 by selective wire-bonding during module build. Laser
                 fuses enable yield enhancement by substituting eight
                 512 Kb array I/O slices for nine in each quadrant of
                 the 18 Mb array. This substitution is independent in
                 each quadrant and results in 1 Mb $\times$ 16 operation
                 with 2 Mb $\times$ 8, 4 Mb $\times$ 4, and 4 Mb
                 $\times$ 4 with any 4 Mb independently selectable (4 Mb
                 $\times$ 4 w/4 CE). Input and control circuitry are
                 designed such that performance margins are constant
                 across output and functional configurations. The
                 architecture also provides for `cut-downs' to 16 Mb,
                 4.5 Mb, and 4 Mb chips with I/O and function as
                 above.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  classcodes =   "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5310 (Storage system design); C5320G
                 (Semiconductor storage)",
  classification = "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5310 (Storage system design); C5320G
                 (Semiconductor storage)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1 Mbit; 16 Mbit; 18 Bit; 18 bit; 18 Mbit; 2 Mbit; 3.4
                 V; 4 Bit; 4 bit; 4 Mbit; 4.5; 4.5 Mbit; 5 V; 9 Bit; 9
                 bit; chip output; Chip output configuration; CMOS
                 memory circuits; CMOS process; configuration;
                 configurations; Control circuitry; control circuitry;
                 DRAM chips; integrated circuit design; integrated
                 circuit technology; integrated circuit yield; M2; M2
                 configurations; Mbit; memory architecture; Multipurpose
                 DRAM architecture; multipurpose DRAM architecture;
                 Optimal power; optimal power; Optimization;
                 optimization; Performance; performance; Performance
                 margins; performance margins; Product flexibility;
                 product flexibility; Selective wire-bonding; selective
                 wire-bonding; Wafer screen tests; wafer screen tests;
                 Yield enhancement; yield enhancement",
  numericalindex = "Storage capacity 1.9E+07 bit; Voltage 3.4E+00 V;
                 Voltage 5.0E+00 V; Storage capacity 2.1E+06 bit;
                 Storage capacity 1.0E+06 bit; Word length 9.0E+00 bit;
                 Word length 1.8E+01 bit; Storage capacity 4.2E+06 bit;
                 Word length 4.0E+00 bit; Storage capacity 1.7E+07 bit;
                 Storage capacity 4.7E+06 bit",
  thesaurus =    "CMOS memory circuits; DRAM chips; Integrated circuit
                 design; Integrated circuit technology; Integrated
                 circuit yield; Memory architecture",
  treatment =    "P Practical; X Experimental",
}

@Article{Kuchta:1995:PFD,
  author =       "D. M. Kuchta and H. A. Ainspan and F. J. Canora and R.
                 P. {Schneider, Jr.}",
  title =        "Performance of fiber-optic data links using 670-nm cw
                 {VCSELs} and a monolithic {Si} photodetector and {CMOS}
                 preamplifier",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "63--72",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#seven",
  abstract =     "To be competitive with copper technology for links and
                 bus applications, optoelectronics must be made
                 affordable. One means of achieving a low-cost
                 optoelectronics link is to adapt volume-manufactured
                 components. This may imply CMOS optoelectronic
                 integrated circuits (OEICs), which are suggested by the
                 huge CMOS IC volumes being produced for computer logic
                 and memory, and red laser diodes, which are already in
                 demand for the consumer and storage markets. In this
                 paper, we demonstrate a potential low-cost link using a
                 monolithically integrated Si photodiode and CMOS
                 preamplifier, a multimode fiber-optic transmission
                 medium, and red, vertical-cavity surface-emitting
                 lasers (VCSELs). The integrated receiver shows a 3.5-dB
                 improvement in received power when light at 670 nm
                 instead of 845 nm is used; it operates error free at
                 both the Fibre Channel rate of 531.25 Mb/s and the
                 SONET OC-12 rate of 622.08 Mb/s. The red VCSELs are
                 shown to be capable of a 1.5-Gb/s transmission data
                 rate with as little as 18 mW average power dissipation.
                 The potential for fabricating arrays using both of
                 these technologies for optical buses is discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B6260 (Optical links and equipment); B2570D (CMOS
                 integrated circuits); B1220 (Amplifiers); B7230C
                 (Photodetectors); B4270 (Integrated optoelectronics);
                 B4320J (Semiconductor lasers); B4360 (Laser
                 applications)",
  classification = "B1220 (Amplifiers); B2570D (CMOS integrated
                 circuits); B4270 (Integrated optoelectronics); B4320J
                 (Semiconductor lasers); B4360 (Laser applications);
                 B6260 (Optical links and equipment); B7230C
                 (Photodetectors)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1.5; 1.5 Gbit/s; 531.25 Mbit/s; 622.08 Mbit/s; 670 Nm;
                 670 nm; applications; Arrays; arrays; circuits; CMOS;
                 CMOS analogue integrated circuits; CMOS optoelectronic
                 integrated; CMOS optoelectronic integrated circuits;
                 CMOS preamplifier; data communication; equipment;
                 Fiber-optic data links; fiber-optic data links; Fibre
                 channel rate; fibre channel rate; Gbit/s; integrated;
                 integrated optoelectronics; Integrated receiver;
                 integrated Si photodiode; laser beam; low-cost;
                 Low-cost link; low-cost link; Low-cost optoelectronics
                 link; medium; monolithic integrated circuits;
                 Monolithic Si photodetector; monolithic Si
                 photodetector; monolithically; Monolithically
                 integrated Si photodiode; multimode fiber-optic
                 transmission; Multimode fiber-optic transmission
                 medium; Optical buses; optical buses; optical links;
                 optical receivers; optoelectronics link;
                 photodetectors; preamplifier; preamplifiers; receiver;
                 Red laser diodes; red laser diodes; semiconductor
                 lasers; Si; SONET OC-12 rate; surface emitting lasers;
                 Vertical-cavity surface-emitting lasers;
                 vertical-cavity surface-emitting lasers;
                 Volume-manufactured components; volume-manufactured
                 components",
  numericalindex = "Wavelength 6.7E-07 m; Bit rate 5.3125E+08 bit/s; Bit
                 rate 6.2208E+08 bit/s; Bit rate 1.5E+09 bit/s",
  thesaurus =    "CMOS analogue integrated circuits; Data communication
                 equipment; Integrated optoelectronics; Laser beam
                 applications; Monolithic integrated circuits; Optical
                 links; Optical receivers; Photodetectors;
                 Preamplifiers; Semiconductor lasers; Surface emitting
                 lasers",
  treatment =    "P Practical",
}

@Article{Ewen:1995:CCG,
  author =       "J. F. Ewen and M. Soyuer and A. X. Widmer and K. R.
                 Wrenner and B. D. Parker and H. A. Ainspan",
  title =        "{CMOS} circuits for {Gb/s} serial data communication",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "73--81",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#eight",
  abstract =     "The functional characteristics and design challenges
                 associated with a variety of communication-related
                 circuits are presented. These include the mixed-signal
                 design and noise issues associated with high-speed
                 clock generation and recovery for serial data
                 communication. Hardware results are presented on the
                 noise properties of common integrated
                 voltage-controlled oscillator (VCO) circuits.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B1280 (Mixed analogue-digital circuits); B2570D (CMOS
                 integrated circuits); B6210 (Telecommunication
                 applications); B1230B (Oscillators); B1250 (Modulators,
                 demodulators, discriminators and mixers)",
  classification = "B1230B (Oscillators); B1250 (Modulators,
                 demodulators, discriminators and mixers); B1280 (Mixed
                 analogue-digital circuits); B2570D (CMOS integrated
                 circuits); B6210 (Telecommunication applications)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuit noise; circuits; clock generation; clocks;
                 CMOS circuits; CMOS integrated circuits; common
                 integrated voltage-; Common integrated
                 voltage-controlled oscillator; communication equipment;
                 communication-; Communication-related circuits;
                 controlled oscillator; data; frequency synthesizer PLL;
                 Frequency synthesizer PLL; Gb/s serial data
                 communication; high-speed; High-speed clock generation;
                 mixed analogue-digital integrated; mixed-signal design;
                 Mixed-signal design; noise; Noise; phase locked loops;
                 recovery; Recovery; related circuits;
                 voltage-controlled oscillators",
  thesaurus =    "Circuit noise; Clocks; CMOS integrated circuits; Data
                 communication equipment; Mixed analogue-digital
                 integrated circuits; Phase locked loops;
                 Voltage-controlled oscillators",
  treatment =    "P Practical",
}

@Article{Shin:1995:CDC,
  author =       "H. J. Shin and D. J. Pearson and S. K. Reynolds and A.
                 C. Megdanis and S. Gowda and K. R. Wrenner",
  title =        "Custom design of {CMOS} low-power high-performance
                 digital signal-processing macro for hard-disk-drive
                 applications",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "83--91",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#nine",
  abstract =     "The design challenges and custom design techniques
                 associated with low-power, small-area, high-performance
                 CMOS digital signal-processing circuits for
                 hard-disk-drive applications are presented. The
                 advantages of custom design are demonstrated by an
                 example custom digital FIR filter macro that provides
                 substantial improvement in performance, area, and power
                 dissipation over standard-cell implementations.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B2570D (CMOS integrated circuits); B1265F
                 (Microprocessors and microcomputers); B1270F (Digital
                 filters); C5320C (Storage on moving magnetic media);
                 C5135 (Digital signal processing chips); C5240 (Digital
                 filters)",
  classification = "B1265F (Microprocessors and microcomputers); B1270F
                 (Digital filters); B2570D (CMOS integrated circuits);
                 C5135 (Digital signal processing chips); C5240 (Digital
                 filters); C5320C (Storage on moving magnetic media)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chips; CMOS digital integrated circuits; CMOS digital
                 signal-processing circuits; Custom design; custom
                 design; Custom digital FIR filter macro; custom digital
                 FIR filter macro; digital signal processing;
                 dissipation; FIR filters; hard discs; Hard disk drive;
                 hard disk drive; power; Power dissipation;
                 Standard-cell implementations; standard-cell
                 implementations",
  thesaurus =    "CMOS digital integrated circuits; Digital signal
                 processing chips; FIR filters; Hard discs",
  treatment =    "A Application; P Practical",
}

@Article{Bechade:1995:DDL,
  author =       "R. A. Bechade and R. M. Houle",
  title =        "Digital delay line clock shapers and multipliers",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "93--103",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#ten",
  abstract =     "Two digital techniques have been developed to generate
                 an internal clock signal from an external reference
                 clock supplied to a microprocessor. The first method
                 constitutes a clock shaper circuit that produces an
                 output clock that has a 50\% duty cycle regardless of
                 the duty cycle of the input reference clock. The second
                 technique generates an internal clock that is an N/2
                 multiple of the frequency of the input clock, where N
                 is an integer greater than 1. Both methods are entirely
                 digital and are independent of process and temperature
                 variations. Their accuracy limits are determined by the
                 technology. Both circuits are described and their
                 results compared.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  classcodes =   "B1265Z (Other digital circuits); B7220 (Signal
                 processing and conditioning equipment and techniques);
                 C5150 (Other circuits for digital computers); C5260
                 (Digital signal processing)",
  classification = "B1265Z (Other digital circuits); B7220 (Signal
                 processing and conditioning equipment and techniques);
                 C5150 (Other circuits for digital computers); C5260
                 (Digital signal processing)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Accuracy limits; accuracy limits; clock signal;
                 clocks; delay lines; Digital delay line clock shapers;
                 digital delay line clock shapers; digital integrated
                 circuits; External reference clock; external reference
                 clock; internal; Internal clock signal; Microprocessor;
                 microprocessor; Multipliers; multipliers; multiplying
                 circuits; processing equipment; pulse shaping circuits;
                 signal",
  thesaurus =    "Clocks; Delay lines; Digital integrated circuits;
                 Multiplying circuits; Pulse shaping circuits; Signal
                 processing equipment",
  treatment =    "P Practical; X Experimental",
}

@Article{Dhong:1995:LTC,
  author =       "S. H. Dhong and M. Tanaka and S. W. Tomashot and T.
                 Kirihata",
  title =        "A low-noise {TTL}-compatible {CMOS} off-chip driver
                 circuit",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "105--112",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#eleven",
  abstract =     "Low-noise TTL-compatible off-chip driver (OCD)
                 circuits are very important, especially for low-power
                 electronics, but scaled-down CMOS technology requires a
                 lower operating voltage of 3.3 V, while most
                 applications require 5 V. The dual power-supply
                 requirement makes the design of OCD challenging, first
                 because pull-up devices, especially p-MOS devices, must
                 be able to handle an off-chip voltage of 5.6 V, which
                 is higher than an on-chip V$_{DD}$ of 2.8 V, and second
                 because pull-down devices should be able to discharge a
                 capacitive load of 5.6 V while operating at a minimum
                 on-chip V$_{DD}$ of 2.8 V. This extreme difference in
                 operating voltage makes the circuits susceptible to
                 ringing and performance degradation due to hot-electron
                 effects. In this paper, we describe a low-noise OCD
                 which has been successfully used in IBM
                 second-generation 4 Mb low-power DRAM (LPDRAM) and in
                 other products. For pull-ups, two stacked p-MOS devices
                 with floating n-wells are used, but they are operated
                 in different modes depending on the supply voltage. The
                 pull-down devices are basically composed of two stages,
                 one of which is in the diode configuration with its
                 gate and drain shorted together during the pull-down.
                 Detailed circuit designs to achieve low noise while
                 meeting the performance requirements are described.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B1210 (Power electronics, supply and supervisory
                 circuits); B2570D (CMOS integrated circuits); B1265D
                 (Memory circuits); C5150 (Other circuits for digital
                 computers); C5320G (Semiconductor storage)",
  classification = "B1210 (Power electronics, supply and supervisory
                 circuits); B1265D (Memory circuits); B2570D (CMOS
                 integrated circuits); C5150 (Other circuits for digital
                 computers); C5320G (Semiconductor storage)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2.8 V; 3.3 V; 4 Mb low-power DRAM; 5; 5 V; 5.6 V;
                 Capacitive load; capacitive load; CMOS integrated
                 circuits; Diode configuration; diode configuration;
                 DRAM chips; driver circuits; Dual power-supply; dual
                 power-supply; electronics; Floating n-wells; floating
                 n-wells; generation DRAM; Hot-electron effects;
                 hot-electron effects; IBM second-; IBM
                 second-generation DRAM; Low noise; low noise;
                 low-power; Low-power electronics; P-MOS devices; p-MOS
                 devices; Performance degradation; performance
                 degradation; Pull-up devices; pull-up devices; Ringing;
                 ringing; Scaled-down CMOS technology; scaled-down CMOS
                 technology; Stacked p-MOS devices; stacked p-MOS
                 devices; TTL-compatible CMOS off-chip driver circuit;
                 V",
  numericalindex = "Voltage 3.3E+00 V; Voltage 5.0E+00 V; Voltage
                 5.6E+00 V; Voltage 2.8E+00 V",
  thesaurus =    "CMOS integrated circuits; DRAM chips; Driver
                 circuits",
  treatment =    "A Application; P Practical",
  xxauthor =     "S. H. Dhong and M. Tanaka and S. W. Tomashot and K.
                 Kirihata",
}

@Article{Bose:1995:ATV,
  author =       "P. Bose and S. Surya",
  title =        "Architectural timing verification of {CMOS RISC}
                 processors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "113--129",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#twelve",
  abstract =     "We consider the problem of verification and testing of
                 architectural timing models (``timers'') coded to
                 predict cycles-per-instruction (CPI) performance of
                 advanced CMOS superscalar (RISC) processors. Such
                 timers are used for pre-hardware performance analysis
                 and prediction. As such, these software models play a
                 vital role in processor performance tuning as well as
                 application-based competitive analysis, years before
                 actual product availability. One of the key problems
                 facing a designer, modeler, or application analyst who
                 uses such a tool is to understand how accurate the
                 model is, in terms of the actual design. In contrast to
                 functional simulators, there is no direct way of
                 testing timers in the classical sense, since the
                 ``correct'' execution time (in cycles) of a program on
                 the machine model under test is not directly known or
                 computable from equations, truth tables, or other
                 formal specifications. Ultimate validation (or
                 invalidation) of such models can be achieved under
                 actual hardware availability, by direct comparisons
                 against measured performance. However, deferring
                 validation solely to that stage would do little to
                 achieve the overall purpose of accurate pre-hardware
                 analysis, tuning, and projection. We describe a
                 multilevel validation method which has been used
                 successfully to transform evolving timers into highly
                 accurate pre-hardware models. In this paper, we focus
                 primarily on the following aspects of the methodology:
                 (a) establishment of cause-effect relationships in
                 terms of model defects and the associated fault
                 signatures; (b) derivation of application-based test
                 loop kernels to verify steady-state (periodic) behavior
                 of pipeline flow, against analytically predicted
                 signatures; and (c) derivation of synthetic test cases
                 to verify the ``core'' parameters characterizing the
                 pipeline-level machine organization as implemented in
                 the timer model. The basic tenets of the theory and its
                 application are described in the context of an example
                 processor, comparable in complexity to an advanced
                 member of the PowerPC* 6XX processor family.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5440 (Multiprocessing
                 systems); C6150G (Diagnostic, testing, debugging and
                 evaluating systems); C5220P (Parallel architecture);
                 C5470 (Performance evaluation and testing); C5210B
                 (Computer-aided logic design)",
  classification = "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5210B (Computer-aided
                 logic design); C5220P (Parallel architecture); C5440
                 (Multiprocessing systems); C5470 (Performance
                 evaluation and testing); C6150G (Diagnostic, testing,
                 debugging and evaluating systems)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytically predicted signatures; analytically
                 predicted signatures; Application-based competitive
                 analysis; application-based competitive analysis;
                 application-based test loop; Application-based test
                 loop kernels; architectural; Architectural timing
                 models; CAD; Cause-effect relationships; cause-effect
                 relationships; CMOS; CMOS digital integrated circuits;
                 CMOS RISC processor; CMOS superscalar processors;
                 computer testing; Cycles-per-instruction performance;
                 cycles-per-instruction performance; Execution time;
                 execution time; Fault signatures; fault signatures;
                 kernels; logic; microprocessor chips; Model defects;
                 model defects; multilevel; Multilevel validation;
                 Performance analysis; performance analysis; performance
                 evaluation; pipeline; Pipeline flow; pipeline flow;
                 Pipeline-level machine organization; pipeline-level
                 machine organization; PowerPC 6XX processor family;
                 Pre-hardware models; pre-hardware models; Prediction;
                 prediction; processing; reduced instruction set
                 computing; Software models; software models;
                 superscalar processors; Synthetic test cases; synthetic
                 test cases; Testing; testing; timing models;
                 validation; Verification; verification",
  thesaurus =    "CMOS digital integrated circuits; Computer testing;
                 Logic CAD; Microprocessor chips; Performance
                 evaluation; Pipeline processing; Reduced instruction
                 set computing",
  treatment =    "P Practical; X Experimental",
}

@Article{Bergamaschi:1995:HSI,
  author =       "R. A. Bergamaschi and R. A. O'Connor and L. Stok and
                 M. Z. Moricz and S. Prakash and A. Kuehlmann and D. S.
                 Rao",
  title =        "High-level synthesis in an industrial environment",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "131--148",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#thirteen",
  abstract =     "The use of modern hardware-description languages in
                 the chip design process has allowed designs to be
                 modeled at higher abstraction levels. More powerful
                 modeling styles, such as register-transfer and
                 behavioral level specifications, have spurred the
                 development of high-level synthesis techniques in both
                 industry and academia. However, despite the many
                 research efforts, the technology is not yet in
                 widespread use in industry. This paper presents the IBM
                 High-Level Synthesis System (HIS), which is the first
                 such system to be used in production in IBM. HIS
                 synthesizes gate-level networks from VHDL models at
                 various levels of abstraction. The main algorithms,
                 modeling capabilities, and methodology considerations
                 in the HIS system are presented. Results show that HIS
                 is capable of producing implementations comparable to
                 or better than those of the existing methodology, while
                 shortening the design time significantly. The HIS
                 system is currently in production use and evaluation in
                 several IBM sites for processors and peripheral chip
                 designs, as well as being an external commercial
                 product.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B2570 (Semiconductor integrated circuits); B1265B
                 (Logic circuits); C7410D (Electronic engineering
                 computing); C5210B (Computer-aided logic design);
                 C6140D (High level languages)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); B2570 (Semiconductor
                 integrated circuits); C5210B (Computer-aided logic
                 design); C6140D (High level languages); C7410D
                 (Electronic engineering computing)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Behavioral level specifications; behavioral level
                 specifications; Chip design process; chip design
                 process; description languages; gate-level; Gate-level
                 networks; hardware description languages; hardware-;
                 Hardware-description languages; Hgh-level synthesis;
                 hgh-level synthesis; high level synthesis; IBM;
                 Industrial environment; industrial environment;
                 integrated circuit design; integrated logic circuits;
                 networks; register-; Register-transfer; transfer; VHDL
                 models",
  thesaurus =    "Hardware description languages; High level synthesis;
                 Integrated circuit design; Integrated logic circuits",
  treatment =    "P Practical",
}

@Article{Kuehlmann:1995:VFV,
  author =       "A. Kuehlmann and A. Srinivasan and D. P. LaPotin",
  title =        "{Verity} --- a formal verification program for
                 custom {CMOS} circuits",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "149--165",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#fourteen",
  abstract =     "In an effort to fully exploit CMOS performance, custom
                 design techniques are used extensively in commercial
                 microprocessor design. However, given the complexity of
                 current-generation processors and the necessity for
                 manual designer intervention throughout the design
                 process, proving design correctness is a major concern.
                 In this paper we discuss Verity, a formal verification
                 program for symbolically proving the equivalence
                 between a high-level design specification and MOS
                 transistor-level implementation. Verity applies
                 efficient logic comparison techniques which implicitly
                 exercise the behavior for all possible input patterns.
                 For a given register-transfer level (RTL) system model,
                 which is commonly used in present-day methodologies,
                 Verity validates the transistor implementation with
                 respect to functional simulation and verification
                 performed at the RTL level.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  classcodes =   "B2570D (CMOS integrated circuits); B1130B
                 (Computer-aided circuit analysis and design); B1265
                 (Digital electronics); C7410D (Electronic engineering
                 computing); C5210B (Computer-aided logic design);
                 C6110F (Formal methods)",
  classification = "B1130B (Computer-aided circuit analysis and design);
                 B1265 (Digital electronics); B2570D (CMOS integrated
                 circuits); C5210B (Computer-aided logic design); C6110F
                 (Formal methods); C7410D (Electronic engineering
                 computing)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "CMOS; CMOS digital integrated circuits; CMOS
                 performance; commercial microprocessor; Commercial
                 microprocessor design; comparison; custom CMOS
                 circuits; Custom CMOS circuits; custom design; Custom
                 design; design; equivalence; Equivalence; formal
                 verification; formal verification program; Formal
                 verification program; functional simulation; Functional
                 simulation; high; high-level design; High-level design
                 specification; level synthesis; logic; Logic
                 comparison; MOS transistor-level implementation;
                 performance; register-transfer level; Register-transfer
                 level; specification; verification; Verification;
                 Verity",
  thesaurus =    "CMOS digital integrated circuits; Formal verification;
                 High level synthesis",
  treatment =    "P Practical; R Product Review",
}

@Article{Adler:1995:EIC,
  author =       "E. Adler and J. K. DeBrosse and S. F. Geissler and S.
                 J. Holmes and M. D. Jaffe and J. B. Johnson and C. W.
                 {Koburger III} and J. B. Lasky and B. Lloyd and G. L.
                 Miles and J. S. Nakos and W. P. {Noble, Jr.} and S. H.
                 Voldman and M. Armacost and R. Ferguson",
  title =        "The evolution of {IBM CMOS DRAM} technology",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "167--188",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#fifteen",
  abstract =     "The development of DRAM at IBM produced many novel
                 processes and sophisticated analysis methods.
                 Improvements in lithography and innovative process
                 features reduced the cell size by a factor of 18.8 in
                 the time between the 4 Mb and 256 Mb generations. The
                 original substrate plate trench cell used in the 4 Mb
                 chip is still the basis of the 256 Mb technology being
                 developed today. This paper describes some of the more
                 important and interesting innovations introduced in IBM
                 CMOS DRAMs. Among them, shallow-trench isolation,
                 I-line and deep-UV (DUV) lithography, titanium
                 salicidation, tungsten stud contacts, retrograde
                 n-well, and planarized back-end-of-line (BEOL)
                 technology are core elements of current
                 state-of-the-art logic technology described in other
                 papers in this issue. The DRAM specific features
                 described are borderless contacts, the trench
                 capacitor, trench-isolated cell devices, and the
                 `strap'. Finally, the methods for study and control of
                 leakage mechanisms which degrade DRAM retention time
                 are described.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  classcodes =   "B2570D (CMOS integrated circuits); B1265D (Memory
                 circuits); C5320G (Semiconductor storage)",
  classification = "B1265D (Memory circuits); B2570D (CMOS integrated
                 circuits); C5320G (Semiconductor storage)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "256 Mbit; borderless contacts; Borderless contacts;
                 CMOS memory circuits; degradation; devices; DRAM chips;
                 ep-UV; Ep-UV lithography; I-line; IBM CMOS DRAM
                 technology; integrated circuit; isolation technology;
                 leakage currents; leakage mechanisms; Leakage
                 mechanisms; lithography; Lithography; photolithography;
                 planarized back-end-of-line technology; Planarized
                 back-end-of-line technology; retention time; Retention
                 time degradation; retrograde n-well; Retrograde n-well;
                 shallow-trench isolation; Shallow-trench isolation;
                 strap; Strap; substrate plate; Substrate plate trench
                 cell; technology; Ti salicidation; trench capacitor;
                 Trench capacitor; trench cell; trench-isolated cell;
                 Trench-isolated cell devices; tungsten stud contacts;
                 Tungsten stud contacts",
  numericalindex = "Storage capacity 2.68E+08 bit",
  thesaurus =    "CMOS memory circuits; DRAM chips; Integrated circuit
                 technology; Isolation technology; Leakage currents;
                 Photolithography",
  treatment =    "P Practical",
}

@Article{Chesebro:1995:OGL,
  author =       "D. G. Chesebro and J. W. Adkisson and L. R. Clark and
                 S. N. Eslinger and M. A. Faucher and S. J. Holmes and
                 R. P. Mallette and E. J. Nowak and E. W. Sengle and S.
                 H. Voldman and T. W. Weeks",
  title =        "Overview of gate linewidth control in the manufacture
                 of {CMOS} logic chips",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "189--200",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#sixteen",
  abstract =     "This paper is an overview of the methods used at the
                 Burlington facility of the IBM Microelectronics
                 Division to improve channel-length tolerance control in
                 the manufacture of CMOS logic chips. We cover aspects
                 of (1) the impact of channel-length control on chip
                 performance, yield, and reliability; (2) our use of an
                 electrical linewidth monitor which permits high-volume,
                 accurate measurements to quantify polysilicon gate
                 linewidth variability and its improvements; and (3) our
                 efforts to reduce photolithographic and etching
                 contributions to the linewidth variability.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B2570D (CMOS integrated circuits); B1265B (Logic
                 circuits); B0170N (Reliability); B2550G (Lithography);
                 B2550E (Surface treatment for semiconductor devices)",
  classification = "B0170N (Reliability); B1265B (Logic circuits);
                 B2550E (Surface treatment for semiconductor devices);
                 B2550G (Lithography); B2570D (CMOS integrated
                 circuits)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Burlington; Burlington facility; channel length;
                 Channel length tolerance control; Channel-length
                 control; channel-length control; chip; Chip
                 performance; CMOS logic chips; CMOS logic circuits;
                 electrical linewidth; Electrical linewidth monitor;
                 elemental semiconductors; Etching; etching; facility;
                 Gate linewidth control; gate linewidth control; IBM
                 Microelectronics Division; integrated circuit;
                 integrated circuit manufacture; integrated circuit
                 yield; Manufacture; manufacture; monitor; performance;
                 Photolithography; photolithography; Polysilicon gate
                 linewidth variability; polysilicon gate linewidth
                 variability; Reliability; reliability; Si; silicon;
                 tolerance control; VLSI; Yield; yield",
  thesaurus =    "CMOS logic circuits; Elemental semiconductors;
                 Etching; Integrated circuit manufacture; Integrated
                 circuit reliability; Integrated circuit yield;
                 Photolithography; Silicon; VLSI",
  treatment =    "P Practical",
}

@Article{Leonovich:1995:ICP,
  author =       "G. A. Leonovich and A. P. Ranchino and W. J. Miller
                 and U. E. Tsou",
  title =        "Integrated cost and productivity learning in {CMOS}
                 semiconductor manufacturing",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "201--213",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#seventeen",
  abstract =     "This paper describes a cost and productivity learning
                 process that was carried out on a large-capacity CMOS
                 manufacturing line at the IBM Burlington facility from
                 1991 to 1993. Major productivity gains were realized
                 through process and tool improvements affecting yield,
                 and through work-in-progress optimization and scrap
                 reduction. Significant cost learning was also
                 accomplished through tool cost management, capital
                 depreciation and space cost reductions, and manpower
                 optimization.",
  acknowledgement = ack-nhfb,
  affiliation =  "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  classcodes =   "B2570D (CMOS integrated circuits); B1265 (Digital
                 electronics); B0170E (Production facilities and
                 engineering); B0170N (Reliability); B0140
                 (Administration and management)",
  classification = "714.2; 722.1; 722.4; 911; 912.2; 913.1; B0140
                 (Administration and management); B0170E (Production
                 facilities and engineering); B0170N (Reliability);
                 B1265 (Digital electronics); B2570D (CMOS integrated
                 circuits)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Burlington facility; capital; Capital depreciation;
                 circuit manufacture; CMOS digital integrated circuits;
                 CMOS integrated circuits; CMOS semiconductor
                 manufacture; CMOS semiconductor manufacturing; cost;
                 Cost; cost learning; Cost learning; Costs;
                 depreciation; economics; Electronics industry; IBM; IBM
                 Burlington facility; integrated; integrated circuit
                 yield; Management; manpower optimization; Manpower
                 optimization; Manpower optimization, Integrated circuit
                 manufacture; Microcomputers; productivity;
                 Productivity; Random access storage; reduction; scrap;
                 Scrap reduction; space cost reduction; Space cost
                 reduction; tool cost management; Tool cost management;
                 Work in progress optimization; work-in-progress
                 optimization; Work-in-progress optimization",
  thesaurus =    "CMOS digital integrated circuits; Economics;
                 Integrated circuit manufacture; Integrated circuit
                 yield",
  treatment =    "P Practical",
  xxauthor =     "G. A. Leonovich and A. P. Franchino and W. J. Miller
                 and U. E. Tsou",
}

@Article{Koburger:1995:HCL,
  author =       "C. W. {Koburger III} and W. F. Clark and J. W.
                 Adkisson and E. Adler and P. E. Bakeman and A. S.
                 Bergendahl and A. B. Botula and W. Chang and B. Davari
                 and J. H. Givens and H. H. Hansen and S. J. Holmes and
                 D. V. Horak and C. H. Lam and J. B. Lasky and S. E.
                 Luce and R. W. Mann and G. L. Miles and J. S. Nakos and
                 E. J. Nowak and G. Shahidi and Y. Taur and F. R. White
                 and M. R. Wordeman",
  title =        "A half-micron {CMOS} logic generation",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "215--227",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#eighteen",
  abstract =     "During the early 1990s, half-micron lithography was
                 demonstrated in 16 Mb DRAM fabrication. Utilization of
                 this capability for CMOS logic devices within IBM
                 followed with a trio of programs, each with different
                 performance, density, feature list, and schedule. The
                 first version melded 3.3/3.6-V 16 Mb DRAM MOSFET
                 devices with an improved version of an existing dense,
                 planar, reliable multilevel back-end-of-line (BEOL)
                 metallization and wiring technology. Since it was built
                 directly from existing technologies, it was released
                 quite quickly. A 3.3-V follow-on technology was added
                 several months later. This logic offering added a local
                 interconnect and a faster device. A second follow-on
                 achieved greater speed improvement, calling upon a
                 2.5-V power supply and very tight channel-length
                 control to obtain performances 50\% above previous
                 generation standards, at lower power.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Microelectron. Div., IBM Corp.",
  affiliationaddress = "Essex Junction, VT, USA",
  classcodes =   "B2570D (CMOS integrated circuits); B1265D (Memory
                 circuits); B2550F (Metallisation and interconnection
                 technology); B2550G (Lithography)",
  classification = "704.2; 714.2; 721.2; 722.1; 731.3; B1265D (Memory
                 circuits); B2550F (Metallisation and interconnection
                 technology); B2550G (Lithography); B2570D (CMOS
                 integrated circuits)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "16; 16 Mbit; 2.5 V; 2.5 V, Logic devices; 3.3 V; 3.6
                 V; Back end of line metallization; back-end-of-line
                 metallization; Channel length control; channel-length
                 control; Channel-length control; CMOS integrated
                 circuits; CMOS logic circuits; DRAM chips; DRAM
                 fabrication; DRAM MOSFET devices; Electric variables
                 control; Electric wiring; Fabrication; Half micron CMOS
                 logic generation; Half micron lithography; half-micron
                 CMOS logic generation; Half-micron CMOS logic
                 generation; half-micron lithography; Half-micron
                 lithography; improvement; integrated circuit;
                 integrated circuit metallisation; integrated circuit
                 technology; Interconnection technology;
                 interconnections; lithography; Lithography; local
                 interconnect; Local interconnect; Mbit; MOSFET devices;
                 precision resistor; Precision resistor; Random access
                 storage; reliable multilevel; Reliable multilevel
                 back-end-of-line metallization; speed; Speed
                 improvement; Technology",
  numericalindex = "Storage capacity 1.7E+07 bit; Voltage 3.3E+00 V;
                 Voltage 3.6E+00 V; Voltage 2.5E+00 V",
  thesaurus =    "CMOS logic circuits; DRAM chips; Integrated circuit
                 interconnections; Integrated circuit metallisation;
                 Integrated circuit technology; Lithography",
  treatment =    "P Practical; X Experimental",
}

@Article{Shahidi:1995:CSM,
  author =       "G. G. Shahidi and J. D. Warnock and S. Comfort and S.
                 Fischer and P. A. McFarland and A. Acovic and T. I.
                 Chappell and B. A. Chappell and T. H. Ning and C. J.
                 Anderson and R. H. Dennard and J. Y.-C. Sun and M. R.
                 Polcari and B. Davari",
  title =        "{CMOS} scaling in the 0.1-$\mu$m, 1.{X}-volt regime
                 for high performance applications",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "229--244",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#nineteen",
  abstract =     "Deep-submicron CMOS is the primary technology for ULSI
                 systems. Currently, the state-of-the-art CMOS device
                 has a 0.25-$\mu$m effective channel length and operates
                 at 2.5 V. As the CMOS technology is extended into the
                 deep submicron range, it is estimated that the next
                 generation will have a nominal channel length of
                 0.15$\mu$m with a supply voltage of <or=2 V. In this
                 paper, two potential technologies with application to
                 1.X-V CMOS are presented. First, a bulk CMOS technology
                 with the nominal channel length of 0.15$\mu$m is
                 described. It is next argued that because of issues
                 related to power dissipation, such a device may face
                 problems when operated at its maximum speed-density
                 potential in high-performance logic chips. CMOS on a
                 silicon-on-insulator (SOI) substrate offers circuits
                 with lower power at the same performance. Such a CMOS
                 technology, with channel lengths down to less than
                 0.1$\mu$m, is described next. This technology is
                 particularly useful for applications near a 1.0-V
                 supply. We describe, for example, a 512 Kb SRAM with an
                 access time of less than 3.5 ns at 1.X V. The clear
                 power-performance advantage of CMOS on SOI over that of
                 CMOS on bulk silicon in the 1.X-V regime makes it the
                 technology of choice for sub-0.25-$\mu$m CMOS
                 generations.",
  acknowledgement = ack-nhfb,
  affiliation =  "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  affiliationaddress = "Yorktown Heights, NY, USA",
  chemicalindex = "Si/sur Si/ss",
  classcodes =   "B2570D (CMOS integrated circuits); B1265 (Digital
                 electronics); B1265D (Memory circuits)",
  classification = "525.4; 714.2; 721.3; 722.1; B1265 (Digital
                 electronics); B1265D (Memory circuits); B2570D (CMOS
                 integrated circuits)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.1 mum; 0.1 Mum; 0.15 mum; 0.15 Mum; 1 V; 1.X-volt
                 regime; 2 V; 512 Kb SRAM; 512 kbit; 512 Kbit; bulk CMOS
                 technology; Bulk CMOS technology; CMOS devices; CMOS
                 digital integrated circuits; CMOS integrated circuits;
                 CMOS scaling; CMOS technology; Deep submicron CMOS;
                 deep-submicron CMOS; Deep-submicron CMOS; dissipation;
                 effective channel; Effective channel length; Energy
                 dissipation; high-; High-performance logic chips; IC;
                 IC technology; integrated circuit; length; Logic chips;
                 Logic circuits; maximum speed-density potential;
                 Maximum speed-density potential; nominal channel
                 length; Nominal channel length; Nominal CMOS channel
                 length; Performance; performance logic chips; power;
                 Power dissipation; power-performance;
                 Power-performance; Random access storage; Semiconductor
                 devices; Silicon on insulator technology;
                 silicon-on-insulator; silicon-on-insulator substrate;
                 Silicon-on-insulator substrate; SOI; SRAM chips;
                 state-of-the-art CMOS; State-of-the-art CMOS;
                 substrates; Substrates; technology; ULSI; ULSI
                 circuits",
  numericalindex = "Size 1.0E-07 m; Size 1.5E-07 m; Voltage 2.0E+00 V;
                 Voltage 1.0E+00 V; Storage capacity 5.24E+05 bit",
  thesaurus =    "CMOS digital integrated circuits; Integrated circuit
                 technology; Silicon-on-insulator; SRAM chips;
                 Substrates; ULSI",
  treatment =    "P Practical",
  xxauthor =     "G. G. Shahidi and J. D. Warnock and J. Comfort and S.
                 Fischer and P. A. McFarland and A. Acovic and T. I.
                 Chappell and B. A. Chappell and T. H. Ning and C. J.
                 Anderson and R. H. Dennard and J. Y.-C. Sun and M. R.
                 Polcari and B. Davari",
}

@Article{Taur:1995:CSC,
  author =       "Y. Taur and Y.-J. Mii and D. J. Frank and H.-S. Wong
                 and D. A. Buchanan and S. J. Wind and S. A. Rishton and
                 G. A. Sai-Halasz and E. J. Nowak",
  title =        "{CMOS} scaling into the 21st century: 0.1$\mu$m and
                 beyond",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "245--260",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-1.html#twenty",
  abstract =     "This paper describes the design, fabrication, and
                 characterization of 0.1-$\mu$m-channel CMOS devices
                 with dual n+/p+ polysilicon gates on 35-AA gate oxide.
                 A 2* performance gain over 2,5-V, 0.25-$\mu$m CMOS
                 technology is achieved at a power supply voltage of 1.5
                 V. In addition, a 20* reduction in active power per
                 circuit is obtained at a supply voltage <1 V with the
                 same delay as the 0.25-$\mu$m CMOS. These results
                 demonstrate the feasibility of high-performance and
                 low-power room-temperature 0.1-$\mu$m CMOS technology.
                 Beyond 0.1$\mu$m, a number of fundamental device and
                 technology issues must be examined: oxide and silicon
                 tunneling, random dopant distribution, threshold
                 voltage nonscaling, and interconnect delays. Several
                 alternative device structures (in particular,
                 low-temperature CMOS and double-gate MOSFET) for
                 exploring the outermost limit of silicon scaling are
                 discussed.",
  acknowledgement = ack-nhfb,
  affiliation =  "Thomas J. Watson Research Cent",
  affiliationaddress = "Yorktown Heights, NY, USA",
  chemicalindex = "Si/int Si/el",
  classcodes =   "B2570D (CMOS integrated circuits); B2550F
                 (Metallisation and interconnection technology); B2550B
                 (Semiconductor doping)",
  classification = "701.1; 712.1.1; 714.2; B2550B (Semiconductor
                 doping); B2550F (Metallisation and interconnection
                 technology); B2570D (CMOS integrated circuits)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.1 Mum; 0.1 mum; 0.25 Mum; 0.25 mum; 1 V; 1.5 V; 2.5
                 V; 35 A; Active power per circuit; CMOS; CMOS devices;
                 CMOS integrated circuits; CMOS scaling; CMOS
                 technology; delays; Design; design; dopant; Dopant
                 fluctuations; doping profiles; Double-gate MOSFET;
                 double-gate MOSFET; dual n+/p+ polysilicon; Dual n+/p+
                 polysilicon gates; Electric resistance; Electron
                 tunneling; elemental; Fabrication; fabrication;
                 fluctuations; gates; Gates (transistor); integrated
                 circuit interconnections; Integrated circuit layout;
                 Integrated circuit manufacture; integrated circuit
                 technology; Interconnect delays; interconnect delays;
                 low temperature; Low temperature CMOS; Low-temperature
                 CMOS; low-temperature CMOS; MOSFET devices; nonscaling;
                 Oxide tunnelling; oxide tunnelling; Polysilicon gates;
                 Random dopant distribution; random dopant distribution;
                 Semiconducting silicon; Semiconductor devices;
                 Semiconductor doping; semiconductors; Si; Si
                 tunnelling; Si, CMOS integrated circuits; SiGe devices;
                 silicon; Silicon tunneling; SOI devices; Temperature;
                 threshold voltage; Threshold voltage nonscaling;
                 tunnelling",
  numericalindex = "Size 1.0E-07 m; Size 3.5E-09 m; Voltage 2.5E+00 V;
                 Size 2.5E-07 m; Voltage 1.5E+00 V; Voltage 1.0E+00 V",
  thesaurus =    "CMOS integrated circuits; Delays; Doping profiles;
                 Elemental semiconductors; Integrated circuit
                 interconnections; Integrated circuit technology;
                 Silicon; Tunnelling",
  treatment =    "P Practical",
}

@Article{Anonymous:1995:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "261--273",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:46:57 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:PRIa,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "1/2",
  pages =        "275--280",
  month =        jan # "\slash " # mar,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:46:54 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lagarias:1995:WAB,
  author =       "J. C. Lagarias and C. P. Tresser",
  title =        "A walk along the branches of the extended {Farey}
                 tree",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "283--294",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-3.html#one",
  abstract =     "The rational numbers can be presented as the set of
                 vertices of a degree-tree tree. If $p/q$ and $p'/q'$
                 are two rational numbers written in lowest terms, the
                 difference $pq'-p'q$ depends only on the shape of the
                 path joining $p/q$ to $p'/q'$ on this tree.",
  acknowledgement = ack-nhfb,
  affiliation =  "AT and T Bell Labs., Murray Hill, NJ, USA",
  classcodes =   "C1160 (Combinatorial mathematics); C4210 (Formal
                 logic)",
  classification = "721.1; 921.1; 921.4; 921.6; C1160 (Combinatorial
                 mathematics); C4210 (Formal logic)",
  corpsource =   "AT and T Bell Labs., Murray Hill, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Binary sequences; Boolean algebra; degree-three tree;
                 Degree-three tree, Computation theory; extended Farey
                 tree; Extended Farey tree; Farey tree; number theory;
                 Number theory; rational numbers; Rational numbers;
                 Topology; trees (mathematics); Trees (mathematics)",
  thesaurus =    "Number theory; Trees [mathematics]",
  treatment =    "B Bibliography; T Theoretical or Mathematical",
}

@Article{Franaszek:1995:PDS,
  author =       "P. A. Franaszek and R. D. Nelson",
  title =        "Properties of delay-cost scheduling in time-sharing
                 systems",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "295--314",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/frana/frana.html",
  abstract =     "We consider properties of time-sharing schedulers with
                 operations based on an economic measure termed the
                 delay cost, and relate these to scheduling policies
                 such as those used in VM and MVS. One of these
                 policies, deadline scheduling, is shown to be
                 potentially unstable. We develop delay-cost schedulers
                 that meet similar performance objectives under
                 quasi-equilibrium conditions but which are stable under
                 rapidly varying loads.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  classcodes =   "C6150N (Distributed systems software); C5440
                 (Multiprocessing systems)",
  classification = "723.1; 723.2; 911.1; C5440 (Multiprocessing
                 systems), 722.4; C6150N (Distributed systems
                 software)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Algorithms; conditions; Costs; Data processing;
                 delay-cost scheduling; Delay-cost scheduling; Heuristic
                 programming; Microcomputers; performance objectives;
                 Performance objectives; policies; processor scheduling;
                 quasi-equilibrium; Quasi-equilibrium conditions,
                 Computer systems; scheduling; Scheduling; Scheduling
                 policies; time-sharing systems; Time-sharing systems;
                 virtual machines",
  thesaurus =    "Processor scheduling; Time-sharing systems; Virtual
                 machines",
  treatment =    "P Practical",
}

@Article{Park:1995:FOR,
  author =       "J. Park and S. Vassiliadis and J. G. Delgado-Frias",
  title =        "Flexible oblivious router architecture",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "315--329",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-3.html#three",
  abstract =     "In this paper we present a router architecture that
                 accommodates a family of oblivious routing algorithms.
                 The architecture is suitable for current technologies,
                 and it is intended for multiprocessor and massively
                 parallel systems. Via the proposed architecture, we
                 suggest that general-purpose routers can be designed to
                 accommodate a variety of multiprocessor interconnection
                 networks. In particular, the routing algorithms of
                 those interconnection structures that can be classified
                 as trees, cubes, meshes, and multistage interconnection
                 networks can be accommodated with a flexible, easily
                 implemented architecture. Our investigation strongly
                 suggests that a common design can satisfy at least
                 forty network topologies with the introduction of a few
                 instructions that are very simple to implement. The
                 overall conclusion is that general-purpose
                 cost-effective routers can potentially be designed that
                 perform equally as well as customized routing logic,
                 suggesting the possibility of a common router for
                 multiple interconnection networks. Furthermore, the
                 proposed architecture provides programming capabilities
                 that allow other oblivious routing algorithms not
                 considered in our investigation to be accommodated.",
  acknowledgement = ack-nhfb,
  affiliation =  "Bellcore, Red Bank, NJ, USA",
  classcodes =   "C4230M (Multiprocessor interconnection); C5220P
                 (Parallel architecture); C1160 (Combinatorial
                 mathematics); C4210 (Formal logic); C5440
                 (Multiprocessing systems)",
  classification = "721.1; 721.3; 722.3; 722.4; 723.1; 911.1; C1160
                 (Combinatorial mathematics); C4210 (Formal logic);
                 C4230M (Multiprocessor interconnection); C5220P
                 (Parallel architecture); C5440 (Multiprocessing
                 systems)",
  corpsource =   "Bellcore, Red Bank, NJ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "algorithms; Algorithms; Computer programming; Cost
                 effectiveness; cubes; Cubes; customized routing logic;
                 Customized routing logic, Computer architecture; Data
                 communication systems; Electric network topology;
                 flexible oblivious router architecture; Flexible
                 oblivious router architecture; Formal logic;
                 Interconnection networks; massively parallel systems;
                 Massively parallel systems; meshes; Meshes;
                 Multiprocessing systems; multiprocessor;
                 Multiprocessor; multiprocessor interconnection
                 networks; Multiprocessor interconnection networks;
                 oblivious routing; Oblivious routing algorithms;
                 Router; trees; Trees; trees (mathematics)",
  thesaurus =    "Multiprocessor interconnection networks; Trees
                 [mathematics]",
  treatment =    "P Practical",
}

@Article{Nobakht:1995:UTV,
  author =       "R. A. Nobakht",
  title =        "A unified table-based {Viterbi} subset decoder for
                 high-speed voice-band modems",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "331--334",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-3.html#four",
  abstract =     "A unified table-based subset decoder for the Viterbi
                 algorithm has been designed which is capable of
                 decoding any constellation size for any data rate
                 scheme of the CCITT (Comite Consultatif International
                 Telegraphique et Telephonique) V.32, V.32bis, and IBM
                 V.32ter high-speed, full-duplex voice-band modem
                 implementations with a constant number of computations.
                 In addition, no error is introduced as a result of this
                 subset decoding. The data rates include trellis coded
                 7200-, 9600-, 12000-, 14400-, 16800-, and 19200-bps
                 rates. The number of computations necessary to perform
                 the decoding is the same for any given data rate,
                 resulting in reductions in computational complexity up
                 to a factor of 32 in comparison to existing direct
                 methods. The memory consumption of the decoder is
                 relatively small and increases proportionally with data
                 rate.",
  acknowledgement = ack-nhfb,
  affiliation =  "Rockwell Int. Corp., Newport Beach, CA, USA",
  classcodes =   "B6220J (Modems); B6120B (Codes); C5630 (Networking
                 equipment)C4240C (Computational complexity)",
  classification = "721.1; 722.1; 722.3; 723.1; 723.2; 921.4; B6120B
                 (Codes); B6220J (Modems); C4240C (Computational
                 complexity); C5630 (Networking equipment)",
  corpsource =   "Rockwell Int. Corp., Newport Beach, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Algorithms; band modems; CCITT; computational
                 complexity; Computational complexity; constellation
                 size; Constellation size; Data storage equipment;
                 high-speed voice-; High-speed voice-band modems; IBM
                 V.32ter; IBM V.32ter, Decoding; modems; Modems; Set
                 theory; Trellis codes; Unified table-based Viterbi
                 algorithm; unified table-based Viterbi subset decoder;
                 Unified table-based Viterbi subset decoder; V.32;
                 V.32bis; Viterbi algorithm; Viterbi decoding",
  thesaurus =    "Computational complexity; Modems; Viterbi decoding",
  treatment =    "P Practical",
}

@Article{Anonymous:1995:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "335--348",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:58:20 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "3",
  pages =        "349--368",
  month =        may,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:58:20 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-3.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kuan:1995:PCI,
  author =       "T. S. Kuan",
  title =        "Preface: On-Chip Interconnection Technology",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "370--370",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#one",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ryan:1995:EIT,
  author =       "J. G. Ryan and R. M. Geffken and N. R. Poulin and J.
                 R. Paraszczak",
  title =        "The evolution of interconnection technology at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "371--381",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#two",
  abstract =     "Advances in interconnection technology have played a
                 key role in allowing continued improvements in
                 integrated circuit density, performance, and cost. IBM
                 contributions to interconnection technology over
                 approximately the last ten generations of semiconductor
                 products are reviewed. The development of a planar,
                 back-end-of-line (BEOL) technology, used in IBM DRAM,
                 bipolar, and CMOS logic products since 1988, has led to
                 a threefold increase in the number of wiring levels,
                 aggressive wiring pitches at all interconnection
                 levels, and high-leverage design options such as
                 stacked contacts and vias. Possible future BEOL
                 technologies are also discussed, with emphasis on the
                 use of higher-conductivity wiring and
                 lower-dielectric-constant insulators. It is expected
                 that their use will result in higher performance and
                 reliability. Applications include future, lower-power
                 devices as well as more cost-effective,
                 higher-performance versions of present-day designs.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Microelectronics Div",
  affiliationaddress = "Essex Junction, VT, USA",
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B1265B (Logic circuits); B2570D (CMOS integrated
                 circuits); B2570B (Bipolar integrated circuits); B0170N
                 (Reliability); B1265D (Memory circuits)",
  classification = "701.1; 704; 704.2; 714.2; 721.2; 722.1",
  corpsource =   "Microelectron. Div., IBM Corp., East Fishkill, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "aggressive wiring pitches; Back-end-of-line
                 technology; BEOL technology; bipolar logic; bipolar
                 logic circuits; Chip design; CMOS; CMOS logic circuits;
                 CMOS logic products; conductivity wiring; cost; Cost
                 effectiveness; cost-effective designs; DRAM; DRAM
                 chips; Electric conductivity; Electric contacts;
                 Electric insulators; Electric wiring; high-; IBM;
                 integrated circuit; integrated circuit density;
                 Integrated circuit density; integrated circuit design;
                 Integrated circuit layout; integrated circuit
                 reliability; Integrated circuits; interconnection
                 technology; Interconnection technology;
                 interconnections; leverage design options; logic; Logic
                 devices; low-dielectric-constant insulators; low-power
                 devices; performance; Performance; performance designs;
                 Permittivity; planar back-end-of-line; Product design;
                 Random access storage; reliability; Reliability;
                 review; reviews; stacked contacts; technology; vias;
                 wiring levels; Wiring pitches",
  treatment =    "E Economic; G General Review; P Practical",
}

@Article{Edelstein:1995:VCI,
  author =       "D. C. Edelstein and G. A. Sai-Halasz and Y.-J. Mii",
  title =        "{VLSI} on-chip interconnection performance simulations
                 and measurements",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "383--401",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#three",
  abstract =     "We examine electrical performance issues associated
                 with advanced VLSI semiconductor on-chip
                 interconnections or ``interconnects.'' Performance can
                 be affected by wiring geometry, materials, and
                 processing details, as well as by processor-level
                 needs. Simulations and measurements are used to study
                 details of interconnect and insulator electrical
                 properties, pulse propagation, and CPU cycle-time
                 estimation, with particular attention to potential
                 advantages of advanced materials and processes for
                 wiring of high-performance CMOS microprocessors.
                 Detailed performance improvements are presented for
                 migration to copper wiring, low-[epsilon] dielectrics,
                 and scaled-up interconnects on the final levels for
                 long-line signal propagation.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B2570A (Integrated circuit modelling and process
                 simulation); B2550F (Metallisation and interconnection
                 technology); B2570D (CMOS integrated circuits)",
  classification = "701.1; 704; 704.2; 714.2; 723.5; 942.2",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Advanced materials; advanced VLSI semiconductor
                 on-chip; Circuit density; CMOS integrated circuits;
                 Computer simulation; Copper; copper; CPU cycle-time
                 estimation; CPU cycletime estimation; Cu; Cu wiring;
                 details; Dielectric materials; Electric insulators;
                 Electric properties; Electric variables measurement;
                 Electric wiring; electrical performance;
                 Electromagnetic wave propagation; electromigration;
                 Geometry; high-performance CMOS microprocessors;
                 insulator electrical; integrated circuit; integrated
                 circuit interconnections; interconnections;
                 interconnects; long-line; low-epsilon dielectrics;
                 Microprocessor chips; migration; modelling; On-chip
                 interconnection; processing; processor-level needs;
                 properties; Pulse propagation; pulse propagation;
                 scaled-up interconnects; semiconductor process
                 modelling; Signal propagation; signal propagation;
                 VLSI; VLSI circuits; VLSI on chip interconnection
                 performance simulations; Wiring geometry; wiring
                 geometry",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Mann:1995:SLI,
  author =       "R. W. Mann and L. A. Clevenger and P. D. Agnello and
                 F. R. White",
  title =        "Silicides and local interconnections for
                 high-performance {VLSI} applications",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "403--417",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#four",
  abstract =     "As the minimum VLSI feature size continues to scale
                 down to the 0.1-0.2-$\mu$m regime, the need for
                 low-resistance local interconnections will become
                 increasingly critical. Although reduction in the MOSFET
                 channel length will remain the dominant factor in
                 achieving higher circuit performance, existing local
                 interconnection materials will impose greater than
                 acceptable performance limitations. We review the
                 state-of-the-art salicide and polycide processes, with
                 emphasis on work at IBM, and discuss the limitations
                 that pertain to future implementations in
                 high-performance VLSI circuit applications. A brief
                 review of various silicide-based and tungsten-based
                 approaches for forming local interconnections is
                 presented, along with a more detailed description of a
                 tungsten-based ``damascene'' local interconnection
                 approach.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Microelectronics Div",
  affiliationaddress = "Essex Junction, VT, USA",
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2560R (Insulated gate field effect transistors);
                 B2570D (CMOS integrated circuits)",
  classification = "543.5; 701.1; 704.2; 714.2; 804.2",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "0.1 to 0.2 mum; applications; approaches; circuit;
                 CMOS; CMOS integrated circuits; damascene local
                 interconnection approach; Electric resistance; Electric
                 wiring; Electronics industry; high performance VLSI;
                 IBM; IC; integrated circuit; interconnections; Local
                 interconnection; local interconnections;
                 low-resistance; minimum VLSI feature size; MOSFET;
                 MOSFET channel length; MOSFET devices; performance;
                 Performance; performance limitations; Polycide process;
                 polycide processes; review; reviews; salicide
                 processes; silicides; Silicides; Silicon compounds;
                 state-of-the-art; Tungsten; VLSI; VLSI circuits; W;
                 W-based",
  treatment =    "G General Review; P Practical",
}

@Article{Licata:1995:IFP,
  author =       "T. J. Licata and E. G. Colgan and J. M. E. Harper and
                 S. E. Luce",
  title =        "Interconnect fabrication processes and the development
                 of low-cost wiring for {CMOS} products",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "419--435",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#five",
  abstract =     "As the cost and performance of integrated circuit (IC)
                 interconnections, or ``interconnects,'' become
                 increasingly important to the development and
                 manufacturing of successful advanced IC products, so
                 also do underlying metallization and patterning
                 processes. In particular, the goals of achieving
                 product design specifications, low development cost
                 (high and early yield), low manufacturing cost, and
                 portability across products can only result from
                 applying robust unit processes that combine to form
                 integrable and scalable process modules. In this paper,
                 we review the interconnect fabrication processes used
                 to form currently manufactured IBM CMOS products, and
                 describe the materials and process integration issues
                 that motivated their selection. In addition, we
                 identify factors which may inhibit application of the
                 fabrication processes to future products having smaller
                 dimensions. The review suggests that large improvements
                 in cost and scalability can be achieved by forming
                 dual-damascene monolithic studs/wires. Previously, the
                 dual-damascene approach was not generally applicable
                 because of the lack of suitable metal deposition
                 techniques for filling high-aspect-ratio features with
                 highly conductive metal. However, recent advances may
                 provide that capability both for near-term applications
                 using Al-based wiring, and also for future applications
                 using more extendible Cu-based wiring.",
  acknowledgement = ack-nhfb,
  affiliation =  "Materials Research Corp",
  affiliationaddress = "Congers, NY, USA",
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B2570D (CMOS integrated circuits)",
  classification = "531; 704.2; 714.2; 902.2; 911.1; 913.1",
  corpsource =   "Materials Res. Corp., Congers, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "Al; Al-based wiring; aluminium; Aluminum; Aspect
                 ratio; circuit interconnections; CMOS; CMOS integrated
                 circuits; Conductive materials; copper; Copper; cost;
                 Costs; Cu; damascene monolithic studs/wires;
                 Deposition; design specifications; dual-; Electric
                 wiring; extendible Cu-based wiring; features; high
                 aspect-ratio; integrated; integrated circuit
                 interconnections; Integrated circuit interconnections;
                 Integrated circuit manufacture; integrated circuit
                 metallisation; integrated circuit yield; Interconnect
                 fabrication process; interconnect fabrication
                 processes; interconnects; low; low development cost;
                 low-cost wiring; manufacturing cost; metallization;
                 Metallization; Metallizing; patterning processes;
                 portability; process integration; product; Product
                 design; products; review; reviews; robust unit
                 processes; Scalability; scalable process modules;
                 Selection; Specifications; yield",
  treatment =    "E Economic; G General Review; P Practical",
}

@Article{Cote:1995:LTC,
  author =       "D. R. Cote and S. V. Nguyen and W. J. Cote and S. L.
                 Pennington and A. K. Stamper and D. V. Podlesnik",
  title =        "Low temperature chemical vapor deposition processes
                 and dielectrics for microelectronic circuit
                 manufacturing at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "437--464",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#six",
  abstract =     "Significant progress has been made over the past
                 decade in low-temperature plasma-enhanced and thermal
                 chemical vapor deposition (CVD). The progress has
                 occurred in response to the high demands placed on the
                 insulators of multilevel microelectronic circuits
                 because of the continuing reduction in circuit
                 dimensions. High-aspect-ratio gap filling is foremost
                 among these demands, which also include lower
                 processing temperatures and improved dielectric
                 planarization. This paper reviews the history of
                 interlevel and intermetal dielectrics used in
                 microelectronic circuit manufacturing at IBM and the
                 current status of processes used in IBM manufacturing
                 and development lines, and describes the challenges for
                 future memory and logic chip applications.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Microelectronics Div",
  affiliationaddress = "Hopewell Junction, NY, USA",
  classcodes =   "B0520F (Vapour deposition); B0170E (Production
                 facilities and engineering); B2810 (Dielectric
                 materials and properties)B2570 (Semiconductor
                 integrated circuits); B1265B (Logic circuits); B1265D
                 (Memory circuits)",
  classification = "704; 708.1; 714; 714.2; 802.2; 802.3",
  corpsource =   "Microelectron. Div., IBM Corp., East Fishkill, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "applications; Aspect ratio; Chemical vapor deposition;
                 chemical vapour deposition; circuit dimensions; CVD;
                 dielectric; Dielectric materials; dielectric thin
                 films; dielectrics; Electric insulators; high-aspect-;
                 history; IBM; integrated circuit manufacture;
                 Integrated circuit manufacture; integrated logic
                 circuits; integrated memory circuits; interlevel
                 dielectric; intermetal dielectrics; logic chip; Logic
                 circuits; low temperature chemical vapor deposition
                 processes; Low temperature operations; Low temperature
                 plasma enhanced chemical vapor deposition; low-; lower
                 processing temperatures; memory chip applications;
                 microelectronic circuit manufacturing; Microelectronic
                 circuit manufacturing; microelectronic circuits;
                 Microelectronic processing; Microelectronics;
                 multilevel; planarization; plasma CVD; ratio gap
                 filling; review; reviews; temperature plasma enhanced
                 chemical vapor deposition; thermal chemical vapor
                 deposition; Thermal chemical vapor deposition",
  treatment =    "G General Review; P Practical",
}

@Article{Hu:1995:ESV,
  author =       "C.-K. Hu and K. P. Rodbell and T. D. Sullivan and K.
                 Y. Lee and D. P. Bouldin",
  title =        "Electromigration and stress-induced voiding in fine
                 {Al} and {Al}-alloy thin-film lines",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "465--497",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-4.html#seven",
  abstract =     "Physical phenomena underlying failure due to
                 electromigration and stress-induced voiding in fine Al
                 and Al-alloy thin-film conducting lines are examined in
                 the context of accelerated testing methods and
                 structures. Aspects examined include effects due to
                 line isolation (the absence of reservoirs at conductor
                 ends), solute and precipitate phenomena, conductor
                 critical (Blech) length, microstructure, film
                 deposition conditions, and thermal processing
                 subsequent to film deposition. Emphasis is on the
                 isolated, submicron-wide, Al(Cu)-based thin-film
                 interconnection lines of IBM VLSI logic and memory
                 chips.",
  acknowledgement = ack-nhfb,
  affiliation =  "IBM Research Div",
  affiliationaddress = "Yorktown Heights, NY, USA",
  classcodes =   "B2550F (Metallisation and interconnection technology);
                 B0170N (Reliability); B0170E (Production facilities and
                 engineering); B1265D (Memory circuits); B1265B (Logic
                 circuits); B2570 (Semiconductor integrated circuits)",
  classification = "541.1; 541.2; 701.1; 704; 708.2; 714.2",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Dev",
  keywords =     "accelerated testing methods; Al; Al alloy thin film
                 lines; AlCu; aluminium; aluminium alloys; Aluminum;
                 Aluminum alloys; circuits; conducting; Conductive
                 films; conductor critical Blech length; conductor ends;
                 copper alloys; crystal; Deposition; deposition
                 conditions; Electric conductors; Electric lines;
                 electromigration; Electromigration; failure; failure
                 analysis; film; film deposition; film lines; fine Al
                 alloy thin; Heat treatment; IBM VLSI logic chips; IBM
                 VLSI memory chips; integrated circuit; integrated
                 circuit interconnections; integrated logic circuits;
                 integrated memory; isolated submicron-wide AlCu-based
                 thin-film interconnection; life testing; line
                 isolation; lines; Logic circuits; Memory chips;
                 Microprocessor chips; microstructure; Microstructure;
                 On-chip interconnections; Precipitate; precipitate
                 phenomena; precipitation; reservoirs; solute; Solute;
                 stress-induced voiding; Stress-induced voiding;
                 testing; thermal processing; Thermal processing; Thin
                 films; Thin-film lines; VLSI; VLSI circuits; voids
                 (solid)",
  treatment =    "P Practical; X Experimental",
}

@Article{Anonymous:1995:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "499--??",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:13:58 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1995:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "4",
  pages =        "513--??",
  month =        jul,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 05 07:13:54 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd38-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ohta:1995:UMR,
  author =       "T. Ohta",
  title =        "Use of multiple representations for simulating cloth
                 shapes and motions: An overview",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "523--530",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html#one",
  abstract =     "Cloth is relatively difficult to simulate for computer
                 graphics, primarily because of the complexity of its
                 shapes and motions. Because of the presence of numerous
                 folds and wrinkles of various sizes, conventional means
                 cannot be used to measure or recreate its shapes. This
                 overview describes a method in which a physically based
                 simulation technique is adapted for generating cloth
                 shapes and motions, and presents some examples of
                 images produced by the method. Use is made of a
                 structure composed of multiple representations or
                 ``layers,'' each of which is assigned a different role
                 in calculation: typically, surface rendering, dynamics,
                 collision detection, and stitching. Inclusion of the
                 latter makes it possible to simulate the joining
                 together of several cloth sections, thus making the
                 method applicable to geometrically complicated tasks
                 such as clothing design. Deformations of cloth objects
                 can be calculated by solving associated equations of
                 motion in a time-marching manner, thereby also
                 producing serial data for animation.",
  acknowledgement = ack-nhfb,
  classcodes =   "C6130B (Graphics techniques)",
  corpsource =   "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cloth shapes; collision detection; computer graphics;
                 dynamics; folds; motions; multiple representations;
                 rendering (computer graphics); stitching; surface
                 rendering; wrinkles",
  treatment =    "P Practical",
}

@Article{Niijima:1995:DSF,
  author =       "H. Niijima",
  title =        "Design of a solid-state file using flash {EEPROM}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "531--545",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html#two",
  abstract =     "This paper presents dynamic sector allocation,
                 clustered sector allocation, and background garbage
                 collection --- mechanisms that are key algorithms in
                 solid-state files (SSFs) using flash EEPROMs. Dynamic
                 sector allocation resembles a log-structured file
                 system, which sequentially writes all data
                 modifications to the SSF. Clustered sector allocation
                 is a technique for using the dynamic sector allocation
                 mechanism in an SSF that incorporates a NAND flash
                 EEPROM architecture. Dynamic sector allocation
                 inevitably accumulates obsolete data on the SSF. This
                 ``garbage'' must be erased in order to secure free
                 space on the SSF. The garbage collection mechanism is a
                 free-space-management method performed as a background
                 process in the SSF. These three mechanisms are closely
                 related and work collaboratively to enable flash
                 EEPROMs to perform well in spite of the serious
                 inherent limitations of the devices. We simulated the
                 behavior of several SSFs and observed that 30\% of the
                 storage area of the SSFs must be used as a work area in
                 order to ensure an acceptably low rate of memory-erase
                 operations. We also demonstrated that the lifetime of
                 the SSF is long enough for use in most personal
                 computers. Finally, we have developed SSFs using the
                 NAND type of flash EEPROMs that incorporate the above
                 mechanisms.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320G (Semiconductor storage); C6120 (File
                 organisation)",
  corpsource =   "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "background garbage collection; clustered sector
                 allocation; dynamic sector allocation; EPROM; flash
                 EEPROM; sector allocation; solid-state file;
                 solid-state files; storage management",
  treatment =    "P Practical",
}

@Article{Deutsch:1995:MCL,
  author =       "A. Deutsch and G. V. Kopcsay and C. W. Surovic and B.
                 J. Rubin and L. M. Terman and R. P. {Dunne, Jr.} and T.
                 A. Gallo and R. H. Dennard",
  title =        "Modeling and characterization of long on-chip
                 interconnections for high-performance microprocessors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "547--567",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html#three",
  abstract =     "Long on-chip interconnections with dimensions larger
                 than the minimum ground rules are rigorously analyzed
                 and experimentally characterized for the first time. A
                 test vehicle has been built and characterized with
                 representative wiring found in high-performance CMOS
                 microprocessor chips (line lengths of 0.8-1.6 cm, and
                 line widths of 0.9-4.8$\mu$m using a five-metal-layer
                 structure). The need for distributed RLC
                 transmission-line representation is highlighted through
                 measured and simulated results. By showing the problems
                 encountered when using long, nonuniform on-chip
                 transmission lines, guidelines are developed to take
                 advantage of the lower-resistance interconnections for
                 use in high-speed, cycle-determining paths. Such
                 guidelines are given both for current and optimized
                 wiring practices and for cross-sectional structures.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2550F
                 (Metallisation and interconnection technology); C5130
                 (Microprocessor chips); C5470 (Performance evaluation
                 and testing)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "high-; integrated circuit interconnections; long
                 on-chip interconnections; microprocessor chips;
                 microprocessors; on-chip transmission lines;
                 performance CMOS microprocessor chips; performance
                 evaluation; results; simulated; wiring",
  treatment =    "P Practical",
}

@Article{Nobakht:1995:AAC,
  author =       "R. A. Nobakht",
  title =        "An algorithm for adaptive cancellation of phase
                 jitter",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "569--573",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html#four",
  abstract =     "Proposed here is a new algorithm for adaptive
                 cancellation of phase jitter. If all of the possible
                 sources of phase jitter are known a priori for a given
                 system, it should be possible to adaptively filter out
                 their effects through use of the algorithm. In addition
                 to offering a cost-effective solution for combating the
                 effects of severe phase jitter, the algorithm should
                 respond rapidly to varying sources of phase jitter and
                 should not encounter any noise/bandwidth conflicts.
                 Hence, it should be applicable with no sacrifice in
                 performance.",
  acknowledgement = ack-nhfb,
  classcodes =   "B6210 (Telecommunication applications); C5600 (Data
                 communication equipment and techniques)",
  corpsource =   "Rockwell Int. Corp., Newport Beach, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adaptive cancellation; conflicts; data communication;
                 jitter; noise/bandwidth; phase jitter",
  treatment =    "P Practical",
}

@Article{Agarwal:1995:TAP,
  author =       "R. C. Agarwal and S. M. Balle and F. G. Gustavson and
                 M. Joshi and P. Palkar",
  title =        "A three-dimensional approach to parallel matrix
                 multiplication",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "575--582",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html#five",
  abstract =     "A three-dimensional (3D) matrix multiplication
                 algorithm for massively parallel processing systems is
                 presented. The $P$ processors are configured as a
                 ``virtual'' processing cube with dimensions $p[1]$,
                 $p[2]$, and $p[3]$ proportional to the matrices'
                 dimensions --- $M$, $N$, and $K$. Each processor
                 performs a single local matrix multiplication of size
                 $M/p[1]\times{}N/p[2]\times{}K/p[3]$. Before the local
                 computation can be carried out, each subcube must
                 receive a single submatrix of $A$ and $B$. After the
                 single matrix multiplication has completed, $K/p[3]$
                 submatrices of this product must be sent to their
                 respective destination processors and then summed
                 together with the resulting matrix $C$. The 3D parallel
                 matrix multiplication approach has a factor of
                 $P^{1/6}$ less communication than the 2D parallel
                 algorithms. This algorithm has been implemented on IBM
                 POWERparallel* SP2* systems (up to 216 nodes) and has
                 yielded close to the peak performance of the machine.
                 The algorithm has been combined with Winograd's variant
                 of Strassen's algorithm to achieve performance which
                 exceeds the theoretical peak of the system. (We assume
                 the MFLOPS rate of matrix multiplication to be 2MNK.)",
  acknowledgement = ack-nhfb,
  classcodes =   "C4140 (Linear algebra); C4240P (Parallel programming
                 and algorithm theory); C6110P (Parallel programming)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D parallel matrix multiplication; IBM; local matrix
                 multiplication; massively parallel; matrix
                 multiplication; parallel algorithms; parallel matrix
                 multiplication; POWERparallel SP2 systems; processing;
                 three-dimensional",
  treatment =    "P Practical; T Theoretical or Mathematical",
}

@Article{Anonymous:1995:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "583--594",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:52:26 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:PRIb,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "5",
  pages =        "595--600",
  month =        sep,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:52:26 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-5.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wickramasinghe:1995:P,
  author =       "H. K. Wickramasinghe and D. Rugar",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "602--602",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:53:38 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#one",
  abstract =     "Ten years has passed since the 1986 publication of two
                 issues of the IBM Journal of Research and Development
                 reviewing the scanning tunneling microscopy (STM)
                 technique. In the same year, two IBM Zurich Research
                 Laboratory scientists, G. Binnig and H. Rohrer, shared
                 the Nobel Prize in physics for their pioneering work in
                 this field. Since then, the STM field has grown at a
                 tremendous rate and has stimulated a range of new
                 techniques. The STM showed that it was possible to scan
                 a conducting sample surface with a sharp probe tip
                 located about a nanometer above the surface and, by
                 adjusting the tip-surface distance to maintain a
                 constant current, produce three-dimensional images
                 having atomic-scale resolution. To achieve this
                 resolution, the STM has relied on piezoelectric drives
                 and feedback electronics for scanning and for
                 controlling the vertical motion of the probe tip.
                 Besides atomic imaging, a scanning tunneling
                 spectroscopic (STS) version of the STM has been used to
                 characterize the electron density of states of surfaces
                 from measurements of the voltage dependence of the
                 tunneling current at tip-to-surface distances of about
                 one angstrom. STM has enabled the measurement of a
                 variety of phenomena such as luminescence, nonlinear
                 optical mixing, and the probing of Schottky barriers
                 with ballistic electron emission. In addition, the STM
                 has been used for surface modification, a supreme
                 example of which is the writing of patterns and
                 structures on crystal surfaces by moving single xenon
                 atoms. The STM has also been used to perform localized
                 electrochemistry and to selectively modify surfaces by
                 using the high electric fields available at the probe
                 tip to deposit or remove material. In parallel with
                 these accomplishments and novel studies of conductive
                 surfaces achieved during the early STM years, Binnig,
                 Quate (Stanford), and Gerber (IBM) developed the atomic
                 force microscope (AFM) in 1986. This instrument
                 operated on a principle different from the STM --- it
                 measured the repulsive force interaction between the
                 electron clouds on the probe tip atoms and those on the
                 sample surface atoms --- and opened a path to imaging
                 both insulating and conducting surfaces with atomic
                 resolution. The frictional force microscope, a
                 variation of the AFM, measures the lateral force of
                 atomic interactions as the probe traverses the surface.
                 As AFM technology matured, the force sensitivity
                 increased by several orders of magnitude. The higher
                 sensitivity of attractive-mode or noncontact AFM gave
                 rise to new forms of nanometer-scale microscopies,
                 including magnetic force microscopy (MFM) for imaging
                 magnetic properties and kelvin probe (KPFM) and
                 electrostatic force microscopy (EFM) for imaging charge
                 and surface potentials. Magnetic resonance force
                 microscopy (MRFM) extended the MFM concept to measure
                 nuclear spins --- with the eventual possibility, given
                 sufficient improvement in force sensitivity, of
                 detecting the nuclear spin of a single atom. Other
                 forms of scanning probe microscopes --- those that do
                 not depend on tunneling or forces between a probe tip
                 and a sample surface --- have also been demonstrated.
                 Examples include the scanning thermal microscope, which
                 responds to local thermal properties of surfaces, the
                 scanning capacitance microscope for dopant profiling,
                 and the near-field optical microscope. More recently,
                 the scanning SQUID microscope with a spatial resolution
                 of 10 micrometers has been used to observe half-integer
                 flux quanta, and the femtosecond field-emission camera
                 has been used to detect the motion of individual atoms
                 and molecules. Scanning probe microscopy has found
                 practical application as well. Noncontact AFM for
                 metrology has moved into manufacturing lines. MFM and
                 the scanning capacitance microscope have become tools
                 of development laboratories. Although commercial
                 products have yet to be realized, they are on the
                 horizon. Data storage is an important area of product
                 exploration: The storage and retrieval of information
                 on a 10-nm scale has been demonstrated using scanning
                 probe techniques. Although the achievable data rates do
                 not satisfy present requirements, they are improving;
                 recent demonstrations with near-field optics have
                 brought them much closer to acceptable values. \par

                 In summary, the underlying principle of the STM has
                 provided impetus for the development by many
                 investigators of various related techniques. These
                 techniques utilize the piezoelectric scanning and
                 feedback principles of the STM, but they form images by
                 monitoring a variety of local interactions other than
                 the tunnel current. We have briefly described the
                 evolution of the STM into what can now be generically
                 termed scanning (or proximal) probe microscopy, which
                 has occurred since the first STM-related issues of this
                 Journal. The papers in the present issue describe
                 recent progress by IBM researchers in a number of these
                 new techniques. \par

                 H. Kumar Wickramasinghe and Daniel Rugar, Guest
                 Editors",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Avouris:1995:PET,
  author =       "Ph. Avouris and I.-W. Lyo and Y. Hasegawa",
  title =        "Probing electrical transport, electron interference,
                 and quantum size effects at surfaces with {STM\slash
                 STS}",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "603--616",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#two",
  abstract =     "We use scanning tunneling microscopy (STM) and
                 spectroscopy (STS) to probe electrical transport
                 through the dangling-bond surface states of
                 semiconductors and electron scattering and electron
                 confinement effects in metal surface states.
                 Specifically, we use point contacts between the STM tip
                 and the sample to show the existence of surface
                 electrical transport in Si(111)-$7 \times 7$. Point
                 contacts to silicon islands provide further support for
                 the existence of the surface transport channel and
                 illustrate the role played by carrier scattering at the
                 boundaries of the nanostructure in electrical
                 transport. In contrast to the silicon case, electrons
                 in Shockley-type metal surface states act like a
                 quasi-two-dimensional free-electron gas (2DFEG). This
                 2DFEG is scattered by steps, adsorbates, and defects,
                 and the interference between incident and reflected
                 electron waves leads to an oscillatory local density of
                 states (LDOS). This LDOS is imaged in STM spectroscopic
                 maps, and analysis of the oscillations provides novel
                 information regarding electron scattering by individual
                 surface features. Steps are found to act as barriers
                 for surface electrons, and this property is utilized to
                 confine them and form structures of lower
                 dimensionality. Quasi-1D structures (quantum wires) are
                 generated at narrow terraces of stepped surfaces, while
                 small metal islands behave as 0D structures (quantum
                 dots). Confined states with discrete spectra are
                 observed even at 300 K, and their probability
                 distributions are imaged.",
  acknowledgement = ack-nhfb,
  classcodes =   "A7325 (Surface conductivity and carrier phenomena);
                 A7320D (Electron states in low-dimensional structures);
                 A7340L (Semiconductor-to-semiconductor contacts, p-n
                 junctions, and heterojunctions); A7335 (Mesoscopic
                 systems); A7320H (Surface impurity and defect levels;
                 energy levels of adsorbed species); A7320A (Surface
                 states, band structure, electron density of states);
                 A7215Q (Scattering mechanisms and Kondo effect
                 (metals/alloys))",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "2DFEG; carrier scattering; dangling bonds;
                 dangling-bond surface states; defect states; effect;
                 electrical transport; electron confinement effects;
                 electron interference; electronic density of states;
                 elemental semiconductors; free-electron gas; impurity
                 scattering; lectron scattering; metal; metals;
                 microscopy; nanostructure; nanostructured materials;
                 oscillatory local density of states; point contact
                 spectroscopy; point contacts; quantum dots; quantum
                 interference phenomena; quantum size;
                 quasi-two-dimensional; scanning tunneling; scanning
                 tunneling microscopy; scanning tunnelling; scanning
                 tunnelling spectroscopy; semiconductor; semiconductor
                 quantum wires; semiconductors; Shockley-type metal
                 surface states; Si; Si(111)-7*7; silicon; size;
                 spectroscopy; states; steps; STM/STS; surface; surface
                 conductivity; surface electrical; surface scattering;
                 surface states; surfaces; transport; two-dimensional
                 electron gas",
  treatment =    "X Experimental",
}

@Article{Mate:1995:FMS,
  author =       "C. M. Mate",
  title =        "Force microscopy studies of the molecular origins of
                 friction and lubrication",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "617--627",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#three",
  abstract =     "The atomic force microscope (AFM) has become a
                 valuable instrument in recent years for studying the
                 atomic and molecular origins of friction and
                 lubrication. This paper reviews the effort in our
                 laboratory using force microscopy to develop a
                 molecular-scale understanding of friction and
                 lubrication. Among the topics covered in this paper are
                 (1) the nanomechanics and adhesive forces of lubricated
                 and unlubricated surfaces, (2) the observation of
                 atomic-scale features and their effect on the friction
                 force for AFM tips sliding over graphite and mica
                 surfaces, and (3) the effect of lubricating surfaces
                 with bonded and unbonded perfluoropolyether polymers
                 and with water molecules adsorbed from the ambient.
                 Many of the descriptions developed using macroscopic
                 continuum mechanics analysis are still applicable to
                 these atomic-scale contact zones. However, a complete
                 interpretation of the results requires incorporating
                 descriptions of the atomic and molecular processes into
                 the continuum mechanics analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6220P (Tribology); A0130R (Reviews and tutorial
                 papers; resource letters); A8140P (Friction,
                 lubrication, and wear); A6820 (Solid surface
                 structure); A6845B (Sorption equilibrium at solid-fluid
                 interfaces); A4630P (Friction, wear, adherence,
                 hardness, mechanical contacts)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adhesion; adhesive forces; adsorbed layers; AFM tips;
                 analysis; atomic force microscopy; atomic processes;
                 atomic-scale contact zones; bonded; C; continuum
                 mechanics; force microscopy; friction; graphite;
                 lubricated surfaces; lubrication; macroscopic continuum
                 mechanics; mechanical contact; mica surfaces; molecular
                 processes; molecular-scale; nanomechanics;
                 perfluoropolyether polymers; polymers; review; reviews;
                 sliding; sliding friction; unbonded perfluoropolyether;
                 unlubricated surfaces; water molecules",
  treatment =    "G General Review; T Theoretical or Mathematical; X
                 Experimental",
}

@Article{Lutz:1995:AFM,
  author =       "M. A. Lutz and R. M. Feenstra and J. O. Chu",
  title =        "Atomic force microscopy studies of {SiGe} films and
                 {Si\slash SiGe} heterostructures",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "629--637",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#four",
  abstract =     "Atomic force microscopy (AFM) is used to study the
                 topography of strained SiGe films and multilayer
                 Si/SiGe heterostructures. Strain relaxation processes
                 are found to determine the formation of surface
                 morphology, with distinct morphological features
                 arising from both misfit dislocation formation and
                 three-dimensional growth of coherent islands and pits
                 on the surface. Studies of these features for various
                 values of strain (Ge content) and growth temperature
                 reveal the underlying physical processes determining
                 the strain relaxation. Fourier analysis of AFM images
                 is performed to obtain quantitative roughness
                 information and to separate roughness components of
                 different physical origin.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6865 (Layer structures, intercalation compounds and
                 superlattices: growth, structure and nonelectronic
                 properties); A6820 (Solid surface structure); A6848
                 (Solid-solid interfaces); A6170L (Slip, creep, internal
                 friction and other indirect evidence of dislocations);
                 A6855 (Thin film growth, structure, and epitaxy); A6860
                 (Physical properties of thin films, nonelectronic)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "AFM; AFM images; atomic force microscopy; coherent
                 islands; components; dimensional growth; dislocations;
                 films; Fourier analysis; Ge content; Ge-Si alloys;
                 growth temperature; heterostructures; interface
                 structure; internal stresses; materials; misfit
                 dislocation formation; multilayer Si/SiGe
                 heterostructures; pits; roughness; semiconductor;
                 semiconductor superlattices; semiconductor thin;
                 Si-GeSi; Si/SiGe; SiGe films; strain relaxation;
                 strained SiGe films; stress relaxation; surface;
                 surface morphology; surface structure; three-;
                 topography",
  treatment =    "X Experimental",
}

@Article{Chambliss:1995:USS,
  author =       "D. D. Chambliss and R. J. Wilson and S. Chiang",
  title =        "The use of {STM} to study metal film epitaxy",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "639--654",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#five",
  abstract =     "In this paper we review work we have done at the IBM
                 Almaden Research Center using the scanning tunneling
                 microscope to understand the epitaxial growth of metal
                 films. In particular, we explore the important role of
                 deposit-substrate interactions in controlling growth
                 and film structure, both by strain of the substrate and
                 by place-exchange intermixing. These are illustrated
                 first by the growth traits of Au, Ag, Ni, and Fe on
                 Au(111) and their relationship to the herringbone
                 reconstruction. Au on Ag(110) is presented as a clear
                 example of spontaneous penetration of the substrate by
                 deposited material at room temperature. Fe on Cu(100)
                 is a more subtle example of the effect of
                 place-exchange and of ways to observe it. The
                 martensitic transformation of thicker Fe films on
                 Cu(100) demonstrates the importance of bulklike
                 structural changes in metastable epitaxial films.",
  acknowledgement = ack-nhfb,
  classcodes =   "A6855 (Thin film growth, structure, and epitaxy);
                 A6820 (Solid surface structure); A0130R (Reviews and
                 tutorial papers; resource letters); A6842 (Surface
                 phase transitions and critical phenomena); A6470K
                 (Solid-solid transitions); A8130K (Martensitic
                 transformations)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "20 C; Ag; Ag(110); Au; Au(111); bulklike; Cu; Cu(100);
                 deposit-substrate; epitaxial growth; epitaxial layers;
                 Fe; film structure; herringbone; interactions;
                 intermixing; internal stresses; martensitic
                 transformation; martensitic transformations; metal film
                 epitaxy; metallic; metastable epitaxial films;
                 microscope; Ni; place-exchange; reconstruction; review;
                 reviews; room; scanning tunneling; scanning tunnelling
                 microscopy; spontaneous penetration; STM; strain;
                 structural changes; surface phase transformations;
                 surface reconstruction; temperature; vapour phase
                 epitaxial growth",
  treatment =    "G General Review; X Experimental",
}

@Article{Kirtley:1995:DAS,
  author =       "J. R. Kirtley and M. B. Ketchen and C. C. Tsuei and J.
                 Z. Sun and W. J. Gallagher and Lock See Yu-Jahnes and
                 A. Gupta and K. G. Stawiasz and S. J. Wind",
  title =        "Design and applications of a scanning {SQUID}
                 microscope",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "655--668",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#six",
  abstract =     "The scanning SQUID (Superconducting Quantum
                 Interference Device) microscope is an extremely
                 sensitive instrument for imaging local magnetic fields.
                 We describe one such instrument which combines a novel
                 pivoting lever mechanism for coarse-scale imaging with
                 a piezoelectric tube scanner for fine-scale scans. The
                 magnetic field sensor is an integrated miniature SQUID
                 magnetometer. This instrument has a demonstrated
                 magnetic field sensitivity of < 10$^{-6}$ gauss/[square
                 root ]Hz at a spatial resolution of [approximately] 10
                 $\mu$m. The design and operation of this scanning SQUID
                 microscope are described, and several illustrations of
                 the capabilities of this technique are presented. The
                 absolute calibration of this instrument with an ideal
                 point source, a single vortex trapped in a
                 superconducting film, is shown. The use of this
                 instrument for the first observation of half-integer
                 flux quanta, in tricrystal thin-film rings of
                 YBa[2]Cu[3]O[7]- [delta], is described. The
                 half-integer flux quantum effect is a general test of
                 the symmetry of the superconducting order parameter.
                 One such test rules out symmetry-independent mechanisms
                 for the half-integer flux quantum effect, and proves
                 that the order parameter in YBa[2]Cu[3]O[7]-[delta] has
                 lobes and nodes consistent with $d$-wave symmetry.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0755 (Magnetic instruments and techniques); A0620H
                 (Measurement standards and calibration); A7475
                 (Superconducting films); A7470V (Perovskite phase
                 superconductors); A7460G (Flux pinning, flux motion,
                 fluxon-defect interactions); B7230 (Sensing devices and
                 transducers)B3240C (Superconducting junction devices);
                 B7310L (Magnetic variables measurement); B7130
                 (Measurement standards and calibration); B3220
                 (Superconducting materials)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "10 mum; barium compounds; calibration; coarse-scale
                 imaging; d-wave symmetry; fine-scale scans; flux
                 pinning; half-; half-integer flux quanta; high-;
                 integer flux quantum effect; integrated; Interference
                 Device; local magnetic fields; magnetic field
                 sensitivity; magnetic field sensor; magnetic sensors;
                 magnetometers; mechanism; miniature SQUID magnetometer;
                 parameter; piezoelectric tube scanner; pivoting lever;
                 scanning SQUID microscope; single vortex; spatial
                 resolution; SQUID; superconducting film;
                 superconducting order; Superconducting Quantum;
                 superconducting thin films; symmetry-independent
                 mechanisms; temperature superconductors; thin-film
                 rings; tricrystal; YBa$_2$Cu/sub 3/O/sub 7- delta /;
                 YBa$_2$Cu/sub 3/O/sub 7/; yttrium compounds",
  treatment =    "P Practical; X Experimental",
}

@Article{McClelland:1995:FFC,
  author =       "G. M. McClelland and H. Heinzelmann and F. Watanabe",
  title =        "The femtosecond field-emission camera, a device for
                 continuous observation of the motion of individual
                 adsorbed atoms and molecules",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "669--680",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#seven",
  abstract =     "A new instrument, the femtosecond field-emission
                 camera (FFEC), has been developed to continuously
                 record the motion of single adsorbed atoms or
                 molecules, with an ultimate achievable time resolution
                 of 10$^{-14}$ s. In the FFEC, the motion of an adsorbed
                 species modulates a strong 10$^{-5}$-A field-emission
                 current from a sharp tip. The emitted electrons are
                 focused into a beam, which is swept electrostatically
                 across a detector screen. The tip substrate can be
                 imaged atomically by field ion microscopy. In this
                 paper, the construction and operating principles of the
                 FFEC are described in some detail, and previously
                 published experiments are reviewed. On a <111> W tip,
                 single Cs atoms are observed to jump between sites
                 instantaneously within the 2-ps instrumental
                 resolution. Individual copper phthalocyanine molecules
                 are observed vibrating with respect to the substrate
                 with a period of [approximately] 10 ps. The time
                 resolution of the FFEC is limited principally by the
                 time-of-flight spread of the electrons between the tip
                 and the deflecting field.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A6845B (Sorption equilibrium at solid-fluid
                 interfaces); A6820 (Solid surface structure); A6822
                 (Surface diffusion, segregation and interfacial
                 compound formation); A6830 (Dynamics of solid surfaces
                 and interface vibrations); B2390 (Electron and ion
                 microscopes)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "10 ps; 10E-14 s; 10E-5 A; absorbed atoms; adsorbed
                 layers; adsorbed molecules; adsorbed species; caesium;
                 cameras; continuous observation; copper compounds;
                 copper phthalocyanine; Cs; detector screen; diffusion;
                 electrons; emission current; emission electron
                 microscopes; femtosecond field-emission camera; field;
                 field ion; field-; individual adsorbed atoms;
                 microscopy; molecules; organic compounds; single;
                 single Cs atoms; surface; surface phonons; surface
                 structure; time resolution; time-of-flight spread; W; W
                 tip",
  treatment =    "P Practical; X Experimental",
}

@Article{Mamin:1995:HDS,
  author =       "H. J. Mamin and B. D. Terris and L. S. Fan and S. Hoen
                 and R. C. Barrett and D. Rugar",
  title =        "High-density data storage using proximal probe
                 techniques",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "681--699",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#eight",
  abstract =     "We describe some of the achievements and problems
                 associated with proximal probe-based approaches to
                 high-density data storage. While STM-based methods have
                 demonstrated spectacular areal densities dwarfing
                 anything achievable with today's storage technologies,
                 reliability and data rate issues present serious
                 obstacles. These problems have led us to focus on
                 techniques based on AFM and near-field optics. First,
                 we have developed a thermomechanical writing scheme
                 using an AFM tip. We have addressed many of the
                 practical issues involved, including data rate. With
                 custom low-mass cantilevers, we have demonstrated
                 readback on real data with a data rate of 1.2 Mb/s. We
                 have also pursued nontopographic storage techniques
                 based on charge storage in nitride-oxide semiconductor
                 structures and near-field optical storage. These
                 techniques should be able to achieve densities
                 comparable to those reached with the AFM scheme, with
                 the added advantage that they are fast and reversible.
                 Although it is not yet clear whether any of these
                 probe-based approaches can ever be made practical, they
                 do represent potential pathways to the higher densities
                 that will be needed in the decades ahead.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2575 (Micromechanical device technology); B4120
                 (Optical storage and retrieval); B2530F
                 (Metal-insulator-semiconductor structures)",
  corpsource =   "IBM Res. Div., Almaden Res. Center, San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1.2; AFM; AFM tip; areal densities; atomic force
                 microscopy; based methods; boundaries; charge storage;
                 custom low-mass cantilevers; data rate; digital
                 storage; high-density data storage; Mbit/s; microscopy;
                 nanotechnology; near-field optical storage; near-field
                 optics; nitride-oxide-; nontopographic; optical
                 storage; proximal probe techniques; readback;
                 reliability; scanning tunnelling; semiconductor
                 storage; semiconductor structures;
                 semiconductor-insulator; Si-SiO$_2$-Si/sub 3/N/sub 4/;
                 STM-; storage techniques; thermomechanical writing
                 scheme",
  treatment =    "G General Review; P Practical",
}

@Article{Pohl:1995:STA,
  author =       "D. W. Pohl",
  title =        "Some thoughts about scanning probe microscopy,
                 micromechanics, and storage",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "701--711",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html#nine",
  abstract =     "Interaction and actuation mechanisms used in scanning
                 probe microscopies (SPM) have inherent potential for
                 storage applications, but many unresolved conceptual
                 and technical questions have precluded a thorough
                 assessment of this potential so far. However, the
                 intrinsic properties of SPM instrumentation and
                 tip/sample interactions allow a number of important
                 parameters and their ultimate values to be estimated.
                 Coping with and possibly surpassing established
                 technologies will require massive parallelism of
                 SPM-type recording heads, a condition that might be
                 satisfied in an elegant manner by using SPM-type,
                 circulating piezoelectric flexural actuators. Operation
                 of an entire array of recording heads will require
                 highly precise micromechanical manufacturing and/or
                 sophisticated control mechanisms. The resulting
                 tolerance requirement can be relaxed by choosing
                 long-range SPM interactions (Coulomb forces,
                 capacitance, near-field optics, etc.). Furthermore, the
                 interaction must allow a high recording speed. The
                 restriction to read-only storage can facilitate
                 exploratory work; the writing process in this case
                 might be replaced by replication, similar to the
                 techniques used in the production of compact disks.",
  acknowledgement = ack-nhfb,
  classcodes =   "A0780 (Electron and ion microscopes and techniques);
                 A0710 (Mechanical measurement methods and instruments);
                 A4230N (Optical storage and retrieval); B2575
                 (Micromechanical device technology); B2860
                 (Piezoelectric and ferroelectric devices); B4120
                 (Optical storage and retrieval)",
  corpsource =   "Zurich Res. Lab., IBM Res. Div., Ruschlikon,
                 Switzerland",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "actuation mechanisms; capacitance; circulating;
                 Coulomb forces; digital storage; high recording speed;
                 interactions; long-range SPM; manufacturing;
                 microactuators; micromachining; micromechanical;
                 micromechanical devices; micromechanics; microscopy;
                 near-field; optical storage; optics; piezoelectric
                 actuators; piezoelectric flexural actuators; read-only
                 storage; recording heads; replication; scanning probe;
                 scanning probe microscopies; scanning probe microscopy;
                 SPM; storage; tip/sample interactions; tolerance
                 requirement; writing process",
  treatment =    "G General Review; P Practical",
}

@Article{Anonymous:1995:RPIe,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors in other
                 journals",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "713--728",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:53:36 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:PRIc,
  author =       "Anonymous",
  title =        "Patents recently issued to {IBM} inventors",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "729--728",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:53:34 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 39",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "739--743",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:53:23 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1995:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 39",
  journal =      j-IBM-JRD,
  volume =       "39",
  number =       "6",
  pages =        "745--751",
  month =        nov,
  year =         "1995",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 12:53:37 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd39-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ziegler:1996:PTC,
  author =       "J. F. Ziegler and G. R. Srinivasan",
  title =        "Preface: Terrestrial Cosmic Rays and Soft Errors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "2--2",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#one",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ziegler:1996:IES,
  author =       "J. F. Ziegler and H. W. Curtis and H. P. Muhlfeld and
                 C. J. Montrose and B. Chin and M. Nicewicz and C. A.
                 Russell and W. Y. Wang and L. B. Freeman and P. Hosier
                 and L. E. LaFave and J. L. Walsh and J. M. Orro and G.
                 J. Unger and J. M. Ross and T. J. O'Gorman and B.
                 Messina and T. D. Sullivan and A. J. Sykes and H.
                 Yourke and T. A. Enger and V. Tolat and T. S. Scott and
                 A. H. Taber and R. J. Sussman and W. A. Klein and C. W.
                 Wahaus",
  title =        "{IBM} experiments in soft fails in computer
                 electronics (1978--1994)",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "3--18",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#two",
  abstract =     "This historical review covers IBM experiments in
                 evaluating radiation-induced soft fails in LSI
                 electronics over a fifteen-year period, concentrating
                 on major scientific and technical advances which have
                 not been previously published.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0180 (Other general electrical engineering topics);
                 B0170N (Reliability); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer electronics; failure; failure analysis;
                 historical review; history; IBM; integrated circuit
                 reliability; large scale integration; LSI electronics;
                 radiation effects; radiation-induced; reviews; soft
                 fails",
  treatment =    "G General Review; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ziegler:1996:TCR,
  author =       "J. F. Ziegler",
  title =        "Terrestrial cosmic rays",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "19--39",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#three",
  abstract =     "This paper reviews the basic physics of those cosmic
                 rays which can affect terrestrial electronics. Cosmic
                 rays at sea level consist mostly of neutrons, protons,
                 pions, muons, electrons, and photons. The particles
                 which cause significant soft fails in electronics are
                 those particles with the strong interaction: neutrons,
                 protons, and pions. At sea level, about 95\% of these
                 particles are neutrons. The quantitative flux of
                 neutrons can be estimated to within $3\times$, and the
                 relative variation in neutron flux with latitude,
                 altitude, diurnal time, earth's sidereal position, and
                 solar cycle is known with even higher accuracy. The
                 possibility of two particles of a cascade interacting
                 with a single circuit to cause two simultaneous errors
                 is discussed. The terrestrial flux of nucleons can be
                 attenuated by shielding, making a significant reduction
                 in the electronic system soft-error rate. Estimates of
                 such attenuation are made.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B2570 (Semiconductor integrated
                 circuits); B5230 (Electromagnetic compatibility and
                 interference)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "altitude; analysis; cosmic ray interactions; diurnal
                 time; electron beam effects; electrons; failure;
                 integrated circuit reliability; latitude; muons;
                 neutron effects; neutrons; photons; pions; proton
                 effects; protons; quantitative flux; shielding;
                 sidereal position; simultaneous errors; soft fails;
                 soft-error rate; solar cycle; terrestrial cosmic rays;
                 terrestrial electronics; terrestrial flux",
  treatment =    "G General Review; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{OGorman:1996:FTC,
  author =       "T. J. O'Gorman and J. M. Ross and A. H. Taber and J.
                 F. Ziegler and H. P. Muhlfeld and C. J. Montrose and H.
                 W. Curtis and J. L. Walsh",
  title =        "Field testing for cosmic ray soft errors in
                 semiconductor memories",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "41--50",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#four",
  abstract =     "This paper presents a review of experiments performed
                 by IBM to investigate the causes of soft errors in
                 semiconductor memory chips under field test conditions.
                 The effects of alpha-particles and cosmic rays are
                 separated by comparing multiple measurements of the
                 soft-error rate (SER) of samples of memory chips deep
                 underground and at various altitudes above the earth.
                 The results of case studies on four different memory
                 chips show that cosmic rays are an important source of
                 the ionizing radiation that causes soft errors. The
                 results of field testing are used to confirm the
                 accuracy of the modeling and the accelerated testing of
                 chips.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B0170E (Production
                 facilities and engineering); B2570 (Semiconductor
                 integrated circuits); B0170N (Reliability)",
  corpsource =   "IBM Corp., Essex Junction, VT, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "accelerated testing; alpha-particle effects; circuit
                 reliability; cosmic ray interactions; cosmic ray soft
                 errors; field; IBM; integrated; integrated circuit
                 testing; ionizing radiation; life testing; memory
                 circuits; semiconductor memories; soft-error rate; test
                 conditions",
  treatment =    "P Practical; X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ziegler:1996:ATC,
  author =       "J. F. Ziegler and H. P. Muhlfeld and C. J. Montrose
                 and H. W. Curtis and T. J. O'Gorman and J. M. Ross",
  title =        "Accelerated testing for cosmic soft-error rate",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "51--72",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#five",
  abstract =     "This paper describes the experimental techniques which
                 have been developed at IBM to determine the sensitivity
                 of electronic circuits to cosmic rays at sea level. It
                 relates IBM circuit design and modeling, chip
                 manufacture with process variations, and chip testing
                 for SER sensitivity. This vertical integration from
                 design to final test and with feedback to design allows
                 a complete picture of LSI sensitivity to cosmic rays.
                 Since advanced computers are designed with LSI chips
                 long before the chips have been fabricated, and the
                 system architecture is fully formed before the first
                 chips are functional, it is essential to establish the
                 chip reliability as early as possible. This paper
                 establishes techniques to test chips that are only
                 partly functional (e.g., only 1Mb of a 16Mb memory may
                 be working) and can establish chip soft-error upset
                 rates before final chip manufacturing begins. Simple
                 relationships derived from measurement of more than 80
                 different chips manufactured over 20 years allow total
                 cosmic soft-error rate (SER) to be estimated after only
                 limited testing. Comparisons between these accelerated
                 test results and similar tests determined by `field
                 testing' (which may require a year or more of testing
                 after manufacturing begins) show that our experimental
                 techniques are accurate to a factor of 2.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B0170E (Production facilities
                 and engineering); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "accelerated testing; chip manufacture; chip
                 reliability; chip testing; circuit design; cosmic ray
                 interactions; cosmic soft-error rate; IBM; integrated
                 circuit design; integrated circuit reliability;
                 integrated circuit testing; large scale integration;
                 life testing; LSI; production testing; sea level;
                 sensitivity; SER; soft-error rate; soft-error upset
                 rates",
  treatment =    "P Practical; X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ziegler:1996:PFC,
  author =       "J. F. Ziegler and P. A. Saunders and T. H. Zabel",
  title =        "Portable {Faraday} cup for nonvacuum proton beams",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "73--76",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#six",
  abstract =     "A portable Faraday cup design is described for the
                 accurate measurement of large-diameter, low-current,
                 and high-energy proton beams traveling in air. The unit
                 has been tested with protons from 4 to 300 MeV. The
                 unit has an accuracy of 10\% for beams of 1 pA,
                 improving to about 2\% accuracy for ion currents of 20
                 pA to 1 $\mu$A.",
  acknowledgement = ack-nhfb,
  classcodes =   "A2925F (Beam handling, focusing, pulsing, stripping
                 and diagnostics); A0620H (Measurement standards and
                 calibration); A2940 (Radiation detectors); B7410B
                 (Particle beam handling and diagnostics); B5180D
                 (Electrostatic devices); B7130 (Measurement standards
                 and calibration); B7420 (Particle and radiation
                 detection and measurement)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "1 pA; 20 pA to 1; 4 to 300 MeV; calibration;
                 diagnostics; electrostatic devices; high-energy; ion
                 currents; muA; nonvacuum proton beams; particle beam;
                 portable Faraday cup; proton beams; proton detection",
  treatment =    "A Application; X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Srinivasan:1996:MCS,
  author =       "G. R. Srinivasan",
  title =        "Modeling the cosmic-ray-induced soft-error rate in
                 integrated circuits: An overview",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "77--89",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#seven",
  abstract =     "This paper is an overview of the concepts and
                 methodologies used to predict soft-error rates (SER)
                 due to cosmic and high-energy particle radiation in
                 integrated circuit chips. The paper emphasizes the need
                 for the SER simulation using the actual chip circuit
                 model which includes device, process, and technology
                 parameters as opposed to using either the discrete
                 device simulation or generic circuit simulation that is
                 commonly employed in SER modeling. Concepts such as
                 funneling, event-by-event simulation, nuclear history
                 files, critical charge, and charge sharing are
                 examined. Also discussed are the relative importance of
                 elastic and inelastic nuclear collisions, rare event
                 statistics, and device vs. circuit simulations. The
                 semi-empirical methodologies used in the aerospace
                 community to arrive at SERs [also referred to as
                 single-event upset (SEU) rates] in integrated circuit
                 chips are reviewed. This paper is one of four in this
                 special issue relating to SER modeling. Together, they
                 provide a comprehensive account of this modeling
                 effort, which has resulted in a unique modeling tool
                 called the Soft-Error Monte Carlo Model, or SEMM.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570A (Integrated circuit modelling and process
                 simulation); B1130B (Computer-aided circuit analysis
                 and design); B0240G (Monte Carlo methods); B0170N
                 (Reliability); C7410D (Electronic engineering
                 computing); C1140G (Monte Carlo methods)",
  corpsource =   "IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "aerospace community; charge sharing; chip; circuit
                 analysis computing; circuit model; cosmic ray
                 interactions; cosmic-ray-induced soft-error rate;
                 critical charge; discrete event simulation; event
                 simulation; event upset; event-by-; funneling;
                 high-energy particle; integrated circuit chips;
                 integrated circuit modelling; integrated circuit
                 reliability; Monte Carlo methods; nuclear collisions;
                 nuclear history files; radiation; rare event
                 statistics; semi-empirical methodologies; SER
                 simulation; single-; technology parameters",
  treatment =    "P Practical; T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Tang:1996:NPC,
  author =       "H. H. K. Tang",
  title =        "Nuclear physics of cosmic ray interaction with
                 semiconductor materials: Particle-induced soft errors
                 from a physicist's perspective",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "91--108",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#eight",
  abstract =     "The key issues of cosmic-ray-induced soft-error rates,
                 SER (also referred to as single-event upset, SEU,
                 rates) in microelectronic devices are discussed from
                 the viewpoint of fundamental atomic and nuclear
                 interactions between high-energy particles and
                 semiconductors. From sea level to moderate altitudes,
                 the cosmic ray spectrum is dominated by three particle
                 species: nucleons (protons and neutrons), pions, and
                 muons. The characteristic features of high-energy
                 nuclear reactions of these particles with light
                 elements are reviewed. A major cause of soft errors is
                 identified to be the ionization electron-hole pairs
                 induced by the secondary nuclear fragments produced in
                 certain processes. These processes are the inelastic
                 collisions between the cosmic ray particles and nuclei
                 in the host material. A state-of-the-art nuclear
                 spallation reaction model, NUSPA, is developed to
                 simulate these reactions. This model is tested and
                 validated by a large set of nuclear experiments. It is
                 used to generate the crucial database for the
                 soft-error simulators which are currently used
                 throughout IBM for device and circuit analysis. The
                 relative effectiveness of nucleons, pions, and muons as
                 soft-error-inducing agents is evaluated on the basis of
                 nuclear reaction rate calculations and
                 energy-deposition analysis.",
  acknowledgement = ack-nhfb,
  classcodes =   "B0170N (Reliability); B2570 (Semiconductor integrated
                 circuits)",
  corpsource =   "IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis; circuit reliability; cosmic ray interaction;
                 cosmic ray interactions; energy-deposition; failure
                 analysis; high-energy; inelastic collisions;
                 integrated; ionization electron-hole pairs;
                 microelectronic devices; muons; neutron effects;
                 neutrons; nuclear fragments; nuclear reactions; nuclear
                 spallation; nucleons; particle-induced soft errors;
                 pions; proton effects; protons; reaction model; sea
                 level; secondary; SER; single-event upset; soft-error
                 simulators",
  treatment =    "P Practical; X Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Murley:1996:SMC,
  author =       "P. C. Murley and G. R. Srinivasan",
  title =        "Soft-error {Monte Carlo} modeling program, {SEMM}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "109--118",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#nine",
  abstract =     "The application of a computer program, SEMM
                 (Soft-Error Monte Carlo Modeling), is described. SEMM
                 calculates the soft-error rate (SER) of semiconductor
                 chips due to ionizing radiation. Used primarily to
                 determine whether chip designs meet SER specifications,
                 the program requires detailed layout and process
                 information and circuit Q values.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570A (Integrated circuit modelling and process
                 simulation); B0240G (Monte Carlo methods); B0170N
                 (Reliability); C7410D (Electronic engineering
                 computing); C1140G (Monte Carlo methods)",
  corpsource =   "IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Carlo methods; chip designs; circuit modelling;
                 circuit Q/sub crit/ values; failure analysis;
                 integrated; integrated circuit layout; integrated
                 circuit reliability; ionizing radiation; layout
                 information; Monte; process information; radiation
                 effects; semiconductor chips; SEMM; SER; soft-error
                 Monte Carlo modeling; soft-error rate; specifications",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Freeman:1996:CCC,
  author =       "L. B. Freeman",
  title =        "Critical charge calculations for a bipolar {SRAM}
                 array",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "119--129",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-1.html#ten",
  abstract =     "The critical charge, Q, of a memory array storage cell
                 is defined as the largest charge that can be injected
                 without changing the cell's logic state. The Q of a
                 Schottky-coupled complementary bipolar SRAM array is
                 evaluated in detail. An operational definition of
                 critical charge is made, and the critical charge for
                 the cell is determined by circuit simulation. The
                 dependence of critical charge on upset-pulse wave
                 shape, statistical variations of power supply voltage,
                 temperature gradients, manufacturing process
                 tolerances, and design-related influences due to word-
                 and drain-line resistance was also calculated. A
                 $2\times$ range in Q is obtained for the SRAM memory
                 array cell from simulations of normal ($\pm 3$)
                 variations in manufacturing process tolerances, the
                 shape of the upset current pulse, and local cell
                 temperatures. Using SEMM, a $60\times$ variation of the
                 soft-error rate (SER) is obtained for this range in Q.
                 The calculated SER is compared to experimental values
                 for the chip obtained by accelerated testing. It is
                 concluded that a range in values of the critical charge
                 of a cell due to normal manufacturing and operating
                 tolerances must be considered when calculating
                 soft-error rates for a chip.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265D (Memory circuits); B2570B (Bipolar integrated
                 circuits); B1130B (Computer-aided circuit analysis and
                 design); B0170E (Production facilities and
                 engineering); C7410D (Electronic engineering
                 computing); C5320G (Semiconductor storage)",
  corpsource =   "IBM Corp., East Fishkill, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "accelerated testing; array; array storage cell;
                 bipolar memory circuits; bipolar SRAM array; cellular
                 arrays; circuit analysis; circuit simulation;
                 computing; critical charge calculations; design-related
                 influences; digital simulation; drain-line resistance;
                 integrated circuit design; integrated circuit testing;
                 life testing; local cell temperatures; manufacturing
                 process; memory; power; radiation effects; rate;
                 Schottky-coupled complementary bipolar; soft-error;
                 SRAM chips; supply voltage; temperature gradients;
                 tolerances; upset-pulse wave shape; word-line
                 resistance",
  treatment =    "P Practical; T Theoretical or Mathematical; X
                 Experimental",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "131--??",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 17 09:24:33 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "1",
  pages =        "133--??",
  month =        jan,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 17 09:24:33 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Hauge:1996:PSA,
  author =       "P. Hauge",
  title =        "Papers on Services, Applications, and Solutions:
                 Preface",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "138--138",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Mintzer:1996:TOW,
  author =       "F. C. Mintzer and L. E. Boyle and A. N. Cazes and B.
                 S. Christian and S. C. Cox and F. P. Giordano and H. M.
                 Gladney and M. L. Kelmanson and A. C. Lirani and K. A.
                 Magerlein and A. M. B. Pavani and F. Schiattarella",
  title =        "Toward on-line, worldwide access to {Vatican Library}
                 materials",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "139--162",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#two",
  acknowledgement = ack-nhfb,
  classcodes =   "C7210L (Library automation); C7250 (Information
                 storage and retrieval); C7210 (Information services and
                 centres); C5620W (Other computer networks)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "digital library services; information retrieval;
                 information services; Internet; library automation;
                 manuscripts; misappropriation; multiserver system;
                 online access; printed books; rare books; Vatican
                 Library materials; worldwide access",
  treatment =    "P Practical",
  xxauthor =     "F. C. Mintzer and L. E. Boyle and A. N. Cazes and B.
                 S. Christian and S. C. Cox and F. P. Giordano and H. M.
                 Gladney and J. C. Lee and M. L. Kelmanson and A. C.
                 Lirani and K. A. Magerlein and A. M. B. Pavani and F.
                 Schiattarella",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Taylor:1996:OCI,
  author =       "R. H. Taylor and J. Funda and L. Joskowicz and A. D.
                 Kalvin and S. H. Gomory and A. P. Gueziec and L. M. G.
                 Brown",
  title =        "An overview of computer integrated surgery at the {IBM
                 Thomas J. Watson Research Center}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "163--183",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#three",
  acknowledgement = ack-nhfb,
  classcodes =   "C7330 (Biology and medical computing); C7140 (Medical
                 administration)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer integrated surgery; computer-; craniofacial;
                 medical computing; medical diagnostic computing;
                 medical modeling; minimally invasive surgery; oriented
                 research laboratory; orthopaedics; research strategy;
                 surgery",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Ohbuchi:1996:IMS,
  author =       "R. Ohbuchi and T. Miyazawa and M. Aono and A. Koide
                 and M. Kimura and R. Yoshida",
  title =        "Integrated medical-image system for cancer research
                 and treatment",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "185--210",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#four",
  acknowledgement = ack-nhfb,
  classcodes =   "A8770E (Patient diagnostic methods and
                 instrumentation); A8770G (Patient care and treatment);
                 B7510B (Radiation and radioactivity applications in
                 biomedicine); B7520C (Radiation therapy); C7330
                 (Biology and medical computing); C5260B (Computer
                 vision and image processing techniques); C6160S
                 (Spatial and pictorial databases); C7140 (Medical
                 administration)",
  corpsource =   "Res. Lab., IBM Japan Ltd., Tokyo, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "3D medical images visualisation; anatomy viewer;
                 cancer research and; computed tomography;
                 computer-assisted diagnosis; computerised tomography;
                 data visualisation; environment technology;
                 heterogeneous network of supercomputers; integrated
                 medical image system; medical image; medical
                 information systems; medical-image database;
                 neurosurgery simulator; patient treatment;
                 patient-record database; personal computers;
                 processing; protein databases; synthetic-; treatment;
                 ultrasound echography equipment; visual databases;
                 workstations,; X-ray",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
  xxtitle =      "Integrated medical-image system for cancer research
                 treatment",
}

@Article{Gopisetty:1996:AFS,
  author =       "S. Gopisetty and R. Lorie and J. Mao and M. Mohluddin
                 and A. Sorin and E. Yair",
  title =        "Automated forms-processing software and services",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "211--230",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#five",
  acknowledgement = ack-nhfb,
  classcodes =   "C7100 (Business and administration); C5260B (Computer
                 vision and image processing techniques); C5530 (Pattern
                 recognition and computer vision equipment); C6160S
                 (Spatial and pictorial databases); C1250B (Character
                 recognition)",
  corpsource =   "IBM Almaden Res. Center, San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "automated forms-processing software; business forms;
                 contextual checking; document image processing;
                 document-image systems; form recognition; intelligent
                 character; machine reading; optical character;
                 productivity improvements; recognition; scanned images;
                 software packages; software system",
  treatment =    "A Application; P Practical",
  xxauthor =     "S. Gopisetty and R. Lorie and J. Mao and M. Mohiuddin
                 and A. Sorin and E. Yair",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Lee:1996:PPS,
  author =       "H. S. Lee and S. S. Murthy and S. W. Haider and D. V.
                 Morse",
  title =        "Primary production scheduling at steelmaking
                 industries",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "231--252",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#six",
  acknowledgement = ack-nhfb,
  classcodes =   "C7480 (Production engineering computing); C1230
                 (Artificial intelligence); C1290F (Systems theory
                 applications in industry); C3350C (Control applications
                 in metallurgical industries)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "artificial intelligence; business objectives;
                 computerized scheduling; control; operations;
                 operations research; primary production scheduling;
                 production; research; steel industry; steelmaking
                 industries",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Coppersmith:1996:PMT,
  author =       "D. Coppersmith and D. B. Johnson and S. M. Matyas",
  title =        "A proposed mode for triple {DES} encryption",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "253--262",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-2.html#seven",
  acknowledgement = ack-nhfb,
  classcodes =   "B6120B (Codes); C6130S (Data security)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "ANSI standards; ANSI X9.F.1 triple-DES draft;
                 cryptography; external feedback cipher block chaining;
                 feedback; masking; multiple encryption-triple-DES;
                 output feedback; secret masking values; standard;
                 triple DES encryption; X9.52",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "263--??",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 16 13:12:40 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "2",
  pages =        "275--??",
  month =        mar,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 16 13:12:40 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Chiu:1996:TFI,
  author =       "A. Chiu and I. Croll and D. E. Heim and R. E. {Jones,
                 Jr.} and P. Kasiraj and K. B. Klaassen and C. D. Mee
                 and R. G. Simmons",
  title =        "Thin film inductive heads",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "283--300",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-3.html#one",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B3120N (Magnetic thin
                 film devices)",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "devices; head; head noise; heads; IBM thin-film
                 inductive recording heads; instabilities; magnetic
                 heads; magnetic recording noise; magnetic thin film;
                 multi-turn; signal instability; single-turn heads;
                 technology materials; thin-film; thin-film processes",
  treatment =    "G General Review; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Kishi:1996:IRV,
  author =       "G. T. Kishi",
  title =        "The {IBM} 3495 robotics and vision system",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "301--310",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-3.html#two",
  acknowledgement = ack-nhfb,
  classcodes =   "C5690 (Other data communication equipment and
                 techniques); C1250 (Pattern recognition); C5260B
                 (Computer vision and image processing techniques);
                 C1230D (Neural nets); C5630 (Networking equipment)",
  corpsource =   "IBM Storage Syst. Div., Tucson, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application programs; automated tape library;
                 automatic teaching; command queueing; continuous
                 robotic; Dataserver; Drive Subsystems; enclosure; file
                 servers; IBM 3490 Magnetic Tape; IBM 3495 robotics and
                 vision system; IBM 3495 Tape Library; IBM computers;
                 Library Manager computer; magnetic tape storage;
                 motion; nets; neural; neural network; performance
                 penalty; robot vision; storage; tape cartridge
                 accessor",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{McDaniel:1996:ODS,
  author =       "T. W. McDaniel and P. C. Arnett",
  title =        "Optical data storage media",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "311--330",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-3.html#three",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320K (Optical storage)",
  corpsource =   "IBM Storage Syst. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "addressing; birefringence; data; data archivability;
                 embossed data; geometric design; grooves; low
                 substrate; mechanical integrity; media thin-film
                 structure; optical data storage media; optical disk;
                 optical drive; optical information processing; optical
                 storage; recording media; robust data seeking;
                 technical issues; track following",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Burton:1996:SCC,
  author =       "D. A. Burton and B. McNutt",
  title =        "Storage control cache resource management: Increasing
                 diversity, increasing effectiveness",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "331--340",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-3.html#four",
  acknowledgement = ack-nhfb,
  classcodes =   "C6120 (File organisation); C5320G (Semiconductor
                 storage)",
  corpsource =   "IBM Storage Syst. Div., Tuscon, AZ, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "cache storage; cached; caching algorithms;
                 controllers; storage control cache resource management;
                 storage management",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Yamashita:1996:DRS,
  author =       "A. Yamashita and T. Amano and Y. Hirayama and N. Itoh
                 and S. Katoh and T. Mano and K. Toyokawa",
  title =        "A document recognition system and its applications",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "341--352",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-3.html#five",
  acknowledgement = ack-nhfb,
  classcodes =   "B6140C (Optical information, image and video signal
                 processing); C1250 (Pattern recognition); C5260B
                 (Computer vision and image processing techniques)",
  corpsource =   "Toyko Res. Lab, IBM Res. Div., Kanagawa, Japan",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "adapter card; blob detection; block; character
                 recognition; data; database; document entry system;
                 document image processing; document recognition system;
                 documents; electronic catalog; electronic form; family
                 registration data; functions; image segmentation;
                 Japanese postprocessing; Kanji characters; layout
                 analysis functions; management; model matching;
                 modules; object-oriented management; personal computer;
                 printed; processing; records; segmentation; tag; text;
                 user interface",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "353--??",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 16 13:12:40 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "3",
  pages =        "367--??",
  month =        may,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 16 13:12:40 MDT 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Hsieh:1996:PIA,
  author =       "E. P. Hsieh and M. D. O'Neill",
  title =        "Preface: {IBM ASIC} Design and Testing",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "376--376",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#one",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Bednar:1996:TAL,
  author =       "T. R. Bednar and R. A. Piro and D. W. Stout and L.
                 Wissel and P. S. Zuchowski",
  title =        "Technology-migratable {ASIC} library design",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "377--386",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#two",
  abstract =     "A library strategy has been developed to enable IBM
                 Microelectronics ASIC development to keep pace with
                 rapid technology enhancements and to offer leading-edge
                 performance to ASIC customers. Library elements are
                 designed using migratable design rules to allow designs
                 to be reused in future advanced technologies; and
                 library contents, design methodology, test methodology,
                 and packaging offerings for the ASICs also are
                 consistent between current and future technologies. The
                 benefit to the ASIC customer is an ASIC with a rich
                 library of logic functions, arrays, and I/Os for
                 today's designs, and with a ready migration path into
                 future designs.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265 (Digital electronics); B1285 (Analogue
                 processing circuits); B1280 (Mixed analogue-digital
                 circuits); B1130B (Computer-aided circuit analysis and
                 design); B0170E (Production facilities and
                 engineering); B0170J (Product packaging); C7410D
                 (Electronic engineering computing)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits; circuit CAD;
                 design methodology; IBM; integrated circuit design;
                 integrated circuit packaging; integrated circuit
                 testing; leading-edge performance; library contents;
                 Microelectronics ASIC development; packaging; software
                 libraries; technology-migratable ASIC library design;
                 test methodology",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Engel:1996:DMI,
  author =       "J. J. Engel and T. S. Guzowski and A. Hunt and D. E.
                 Lackey and L. D. Pickup and R. A. Proctor and K.
                 Reynolds and A. M. Rincon and D. R. Stauffer",
  title =        "Design methodology for {IBM ASIC} products",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "387--406",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#three",
  abstract =     "The IBM ASIC design methodology enables a product
                 developer to fully incorporate the high-density,
                 high-performance capabilities of the IBM CMOS
                 technologies in the design of leading-edge products.
                 The methodology allows the full exploitation of
                 technology density, performance, and high testability
                 in an ASIC design environment. The IBM ASIC design
                 methodology builds upon years of experience within IBM
                 in developing design flows that optimize performance,
                 testability, chip density, and time to market for
                 internal products. It has also been achieved by using
                 industry-standard design tools and system design
                 approaches, allowing IBM ASIC products to be marketed
                 externally as well as to IBM internal product
                 developers. This paper describes the IBM ASIC design
                 methodology, and then focuses on the key areas of the
                 methodology that enable a customer to exploit the
                 technology in terms of performance, density, and
                 testability, all in a fast-time-to-market ASIC
                 paradigm. Also emphasized are aspects of the
                 methodology that allow IBM to market its design
                 experience and intellectual property.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570D (CMOS integrated circuits); B1130B
                 (Computer-aided circuit analysis and design); B1265
                 (Digital electronics); C7410D (Electronic engineering
                 computing)",
  corpsource =   "Microelecton. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits;
                 capabilities; chip density; circuit CAD; circuit
                 design; circuit optimisation; CMOS integrated circuits;
                 CMOS technologies; high-density high-performance; IBM
                 ASIC design methodology; integrated; optimization;
                 performance; technology density; technology
                 performance; testability; testability optimization",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Stok:1996:BLS,
  author =       "L. Stok and D. S. Kung and D. Brand and A. D. Drumm
                 and A. J. Sullivan and L. N. Reddy and N. Hieter and D.
                 J. Geiger and H. H. Chao and P. J. Osler",
  title =        "{BooleDozer}: Logic synthesis for {ASICs}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "407--430",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#four",
  abstract =     "Logic synthesis is the process of automatically
                 generating optimized logic-level representation from a
                 high-level description. With the rapid advances in
                 integrated circuit technology and the resultant growth
                 in design complexity, designers increasingly rely on
                 logic synthesis to shorten the design time while
                 achieving performance objectives. This paper describes
                 the IBM logic synthesis system BooleDozer*, including
                 its organization, main algorithms, and how it fits into
                 the design process. The BooleDozer logic synthesis
                 system has been widely used within IBM to successfully
                 synthesize processor and ASIC designs.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265 (Digital electronics); C7410D (Electronic
                 engineering computing); C5210B (Computer-aided logic
                 design); C4210 (Formal logic)",
  corpsource =   "Res. Div., IBM Thomas J. Watson Res. Center, Yorktown
                 Heights, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits; ASIC;
                 Boolean functions; BooleDozer; complexity; design;
                 high-; integrated circuit technology; ISM logic
                 synthesis system; level description; logic CAD;
                 optimized logic-level representation",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Sayah:1996:DPH,
  author =       "J. Y. Sayah and R. Gupta and D. D. Sherlekar and P. S.
                 Honsinger and J. M. Apte and S. W. Bollinger and H. H.
                 Chen and S. DasGupta and E. P. Hsieh and A. D. Huber
                 and E. J. Hughes and Z. M. Kurzum and V. B. Rao and T.
                 Tabtieng and V. Valijan and D. Y. Yang",
  title =        "Design planning for high performance {ASICs}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "431--452",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#five",
  abstract =     "Design planning is emerging as a solution to some of
                 the most difficult challenges of the deep-submicron
                 VLSI design era. Reducing design turnaround time for
                 extremely large designs with ever-increasing clock
                 speeds, while ensuring first-pass implementation
                 success, is exhausting the capabilities of traditional
                 design tools. To solve this problem, we have designed
                 and implemented a hierarchical design planning system
                 that consists of a tightly integrated set of design and
                 analysis tools. The integrated run-time environment,
                 with its rich set of hierarchical, timing-driven design
                 planning and implementation functions, provides an
                 advanced platform for realizing a variety of ASIC and
                 custom methodologies. One of the system's particular
                 strengths is its tight integration with an incremental,
                 static timing engine that assists in achieving timing
                 closure in high-performance designs. The design planner
                 is in production use at IBM internal and at external
                 ASIC design centers.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1280 (Mixed analogue-digital circuits); C7410D
                 (Electronic engineering computing)",
  corpsource =   "Microelectron. Div., IBM Corp., Hopewell Junction, NY,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "analysis tools; application specific integrated
                 circuits; circuit CAD; deep-submicron; design and;
                 design planning; hierarchical design planning system;
                 high performance ASICs; timing-driven design planning;
                 VLSI",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Hathaway:1996:CPC,
  author =       "D. J. Hathaway and R. R. Habra and E. C. Schanzenbach
                 and S. J. Rothman",
  title =        "Circuit placement, chip optimization, and wire routing
                 for {IBM IC} technology",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "453--460",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#six",
  abstract =     "Recent advances in integrated circuit technology have
                 imposed new requirements on the chip physical design
                 process. At the same time that performance requirements
                 are increasing, the effects of wiring on delay are
                 becoming more significant. Larger chips are also
                 increasing the chip wiring demand, and the ability to
                 efficiently process these large chips in reasonable
                 time and space requires new capabilities from the
                 physical design tools. Circuit placement is done using
                 algorithms which have been used within IBM for many
                 years, with enhancements as required to support
                 additional technologies and larger data volumes. To
                 meet timing requirements, placement may be run
                 iteratively using successively refined timing-derived
                 constraints. Chip optimization tools are used to
                 physically optimize the clock trees and scan
                 connections, both to improve clock skew and to improve
                 wirability. These tools interchange sinks of equivalent
                 nets, move and create parallel copies of clock buffers,
                 add load circuits to balance clock net loads, and
                 generate balanced clock tree routes. Routing is done
                 using a grid-based, technology-independent router that
                 has been used over the years to wire chips. There are
                 numerous user controls for specifying router behavior
                 in particular areas and on particular interconnection
                 levels, as well as adjacency restrictions.",
  acknowledgement = ack-nhfb,
  classcodes =   "B2570 (Semiconductor integrated circuits); B1130B
                 (Computer-aided circuit analysis and design); B0260
                 (Optimisation techniques); C7410D (Electronic
                 engineering computing); C1180 (Optimisation
                 techniques)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "chip optimization; chip wiring; circuit layout CAD;
                 circuit optimisation; circuit placement; clock buffers;
                 clock trees; demand; IBM IC; independent router;
                 integrated circuit; integrated circuit technology; scan
                 connections; technology; technology-; timing
                 requirements; timing-derived constraints; wire
                 routing",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Gillis:1996:TMD,
  author =       "P. S. Gillis and T. S. Guzowski and B. L. Keller and
                 R. H. Kerr",
  title =        "Test methodologies and design automation for {IBM
                 ASICs}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "461--474",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#seven",
  abstract =     "IBM manufactures a very large number of different
                 application-specific integrated circuit (ASIC) chips
                 each year. Although these chips are designed by many
                 different customers having various levels of test
                 experience and all having tight deadlines, IBM ASICs
                 have a reputation for their high quality. This quality
                 is due in large part to the heavy focus on design for
                 test (DFT) and the use of design automation to help
                 ensure that customers' chips can be manufactured,
                 tested, and diagnosed with minimal engineering effort.
                 Prospective customers of IBM ASIC technologies find an
                 explicit set of DFT methodologies to follow which
                 provide a relatively painless, almost push-button
                 approach to the generation of high-quality,
                 ``sign-off'' test vectors for their chips. This paper
                 discusses the DFT methodologies used for IBM ASICs and
                 the design automation support that enables designers to
                 be so productive with these methodologies. Data are
                 given for several recently processed chips, some
                 designed outside IBM.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1130B (Computer-aided circuit analysis and design);
                 B1265B (Logic circuits); B1280 (Mixed analogue-digital
                 circuits); B2570 (Semiconductor integrated circuits);
                 C7410D (Electronic engineering computing); C5210 (Logic
                 design methods)",
  corpsource =   "Microelectron. Div., IBM Corp., Essex Junction, VT,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits; ASICs;
                 circuit CAD; design automation; high quality; IBM
                 ASICs; logic; methodologies; test; testing",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Poli:1996:ITA,
  author =       "D. J. Poli and M. S. Berry and J. N. Kruchowski",
  title =        "{IC} technology and {ASIC} design for the {Cray J90}
                 supercomputer",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "475--483",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#eight",
  abstract =     "The decision to use ASIC technology over a full- or
                 semi-custom approach in the design of a computer system
                 is influenced by many factors, and has a significant
                 impact on the design methodology as well as on the
                 completion schedule of the product. The Cray Research
                 J90* line of 100-MHz supercomputer systems is an
                 example of a system whose performance, cost, and
                 schedule needs drove the designers to an ASIC solution.
                 The J90 comprises varying numbers of ten unique ASICs,
                 each designed in a 0.5-$\mu$m CMOS technology. The
                 largest of the ASICs contains more than 500,000
                 equivalent two-way NAND CMOS gates. The design cycle,
                 including integrated circuit and first-level packaging
                 technology selection, took just over two years from
                 concept to production. This paper presents a brief
                 history of the Cray ELS (Entry-Level Systems) division
                 and discusses some of the decision processes and
                 trade-offs made during the design of the J90 system,
                 including the decision to use ASIC technology, and its
                 effect on the overall design methodology and CAD flow.
                 The design methodology, which utilized a
                 ground-rule-based HDL/synthesis approach, and the
                 physical design of the chips, which made use of
                 industry-standard and vendor-proprietary tools, are
                 discussed. Finally, conclusions as to the applicability
                 and the success of utilizing an ``off-the-shelf'' ASIC
                 technology are drawn.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5220 (Computer architecture); C5420 (Mainframes and
                 minicomputers)",
  corpsource =   "Cray Res. Inc., Chippewa Falls, MN, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "application specific integrated circuits;
                 architecture; ASIC design; ASIC solution; computer;
                 Cray; Cray computers; Cray J90 supercomputer; IC
                 technology; multiprocessing systems; Research J90",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Gianos:1996:DCD,
  author =       "C. Gianos and D. Hobson",
  title =        "Design considerations for {Digital's PowerStorm}
                 graphics processor",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "485--494",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#nine",
  abstract =     "The specific development goals for the Digital
                 Equipment Corporation PowerStorm*** graphics processor
                 were improved performance, low product cost, quick time
                 to market, and backward compatibility with existing
                 user software. Achieving these goals required the
                 evaluation and implementation of many new features,
                 enhancements to the existing architecture, and improved
                 development techniques. This paper describes several of
                 the more notable aspects that were considered and
                 includes a discussion of how the underlying technology
                 played a role in meeting the product goals.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5130 (Microprocessor chips); C5540 (Terminals and
                 graphic displays)",
  corpsource =   "Digital Equipment Corp., Maynard, MA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "backward compatibility; computer graphic equipment;
                 coprocessors; Corporation; DEC computers; Digital
                 Equipment; performance; PowerStorm graphics processor;
                 product cost; time to market",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Bishop:1996:PAB,
  author =       "J. W. Bishop and M. J. Campion and T. L. Jeremiah and
                 S. J. Mercier and E. J. Mohring and K. P. Pfarr and B.
                 G. Rudolph and G. S. Still and T. S. White",
  title =        "{PowerPC AS A10} 64 bit {RISC} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "495--505",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html#10",
  abstract =     "The PowerPC AS* A10 64-bit RISC microprocessor is a
                 4.7-million-transistor integrated circuit design, using
                 IBM CMOS 5L 0.5-$\mu$m, 3-V, four-level-metal ASIC
                 technology. Support for the PowerPC AS architecture is
                 implemented in a 213-mm$^2$ die using a semicustom
                 design methodology. Chip density and speed are enhanced
                 through the use of custom macros and multiport arrays.
                 An on-chip phase-locked-loop circuit is used to reduce
                 chip-to-chip clock skew. Full utilization of the
                 four-level-metal interconnect technology was achieved
                 through architectural floorplanning, performance
                 clustering, and timing-driven placement and wiring,
                 with a total wire length of over 102 meters placed on
                 the 14.6 $\times$ 14.6-mm die. The microprocessor is a
                 pipelined, superscalar design with five separate
                 functional units, a 4KB instruction cache, and an 8KB
                 data cache. The design includes parity,
                 error-correction, and error-logging functions, as well
                 as self-test for logic and arrays during power-on. The
                 design is robust and implements a wide range of
                 performance configurations at the system level,
                 allowing direct attachment of DRAM to the processor, or
                 high-performance L2 cache options using high-speed
                 SRAM. An on-chip system I/O bus and bus controller are
                 provided for attachment of peripherals.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); B2570D
                 (CMOS integrated circuits); C5130 (Microprocessor
                 chips); C5220 (Computer architecture)",
  corpsource =   "AS/400 Div., IBM Corp., Endicott, NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "4KB; 8KB data cache; application specific integrated
                 circuits; architectural floorplanning; ASIC; bus
                 controller; circuits; CMOS integrated; computing;
                 custom macros; driven placement; error-correction;
                 error-logging functions; four-level-metal interconnect
                 technology; high-; IBM CMOS 5L; instruction cache; loop
                 circuit; microprocessor chips; multiport arrays;
                 on-chip system I/O bus; parity; performance clustering;
                 performance configurations; phase-locked-; PowerPC AS
                 A10 64 bit RISC microprocessor; reduced instruction
                 set; speed SRAM; superscalar design; technology;
                 timing-; wiring",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pd,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "4",
  pages =        "507--??",
  month =        jul,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 20 13:32:50 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-4.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Johnson:1996:TMF,
  author =       "K. E. Johnson and C. M. Mate and J. A. Merz and R. L.
                 White and A. W. Wu",
  title =        "Thin-film media --- Current and future technology",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "511--536",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-5.html#one",
  abstract =     "In the last ten years, the fundamental technology of
                 recording media has evolved from particulate to thin
                 film. The introduction of magnetoresistive heads in
                 1990 has had further impact on the design of thin-film
                 media. Changes in substrates, magnetic films,
                 overcoats, and lubrication form the basis of the
                 evolution. Design concepts and manufacturing
                 considerations for high-areal-density thin-film disks
                 are described in this paper, with reflections on future
                 enhancements required for media of the next
                 generation.",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B2220E (Thin film
                 circuits); C5320C (Storage on moving magnetic media)",
  corpsource =   "Storage Syst. Div. Lab., IBM Corp., San Jose, CA,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "circuits; lubrication; magnetic disc storage; magnetic
                 films; magnetic thin films; magnetoresistive heads;
                 overcoats; recording media; substrates; thin film;
                 thin-film media",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Schlatter:1996:CTA,
  author =       "B. Schlatter",
  title =        "Computer-aided {3D} tolerance analysis of disk
                 drives",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "537--542",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-5.html#two",
  abstract =     "Disk drives are multicomponent products in which
                 product build variations directly affect quality.
                 Dimensional management, an engineering methodology
                 combined with software tools, was implemented in disk
                 drive development engineering at IBM in San Jose to
                 predict and optimize critical parameters in disk
                 drives. It applies statistical simulation techniques to
                 predict the amount of variation that can occur in the
                 disk drive due to the specified design tolerances,
                 fixturing tolerances, and assembly variations. This
                 paper presents statistics describing the measurement
                 values produced during simulations, a histogram showing
                 the measurement values graphically, and an analysis of
                 the process capability, C [p][k] to ensure robust
                 designs. Additionally, it describes how modeling can
                 determine the location(s) of the predicted variation,
                 the contributing factors, and their percent of
                 contribution. Although a complete 2.5-in. disk drive
                 was modeled and all critical variations such as
                 suspension-to-disk gaps, disk-stack envelope, and merge
                 clearances were analyzed, this paper presents for
                 illustration only one critical disk real estate
                 parameter. The example shows the capability of this
                 methodology. VSA-3D software by Variation Systems
                 Analysis was used.",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C6115
                 (Programming support)",
  corpsource =   "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analysis; assembly; computer-aided 3D tolerance
                 analysis; critical disk; critical parameters;
                 dimensional management; disk drives; engineering;
                 fixturing tolerances; histogram; magnetic disc storage;
                 methodology; multicomponent products; process
                 capability; real estate parameter; software tools;
                 statistical simulation; tolerance analysis; Variation
                 Systems; variations; VSA-3D software",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Asthana:1996:ROD,
  author =       "P. Asthana and B. I. Finkelstein and A. A. Fennema",
  title =        "Rewritable optical disk drive technology",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "543--558",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-5.html#three",
  abstract =     "Optical disk drives provide an effective solution to
                 the growing need for removable high-capacity storage.
                 In this paper, we review the technology behind the
                 optical disk drives used in IBM's optical storage
                 systems. The basic physics of data recording and
                 readout and the engineering of the primary building
                 blocks of an optical drive (the optical head, the servo
                 system, and the data channel) are discussed. We also
                 outline the technological directions of future optical
                 drives as they must continue to improve in performance
                 and capacity.",
  acknowledgement = ack-nhfb,
  classcodes =   "B4120 (Optical storage and retrieval); B3120B
                 (Magnetic recording); C5320K (Optical storage)",
  corpsource =   "Storage Syst. Div., IBM Corp., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "capacity; capacity storage; data; data channel; data
                 recording; IBM's optical storage systems; optical disc
                 storage; optical head; performance; recording;
                 removable high-; rewritable optical disk drive
                 technology; servo system",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Jessani:1996:FPU,
  author =       "R. M. Jessani and C. H. Olson",
  title =        "The floating point unit of the {PowerPC 603e}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "559--566",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-5.html#four",
  abstract =     "The IBM PowerPC 603e* floating-point unit (FPU) is an
                 on-chip functional unit to support IEEE 754 standard
                 single- and double-precision binary floating-point
                 arithmetic operations. The design objectives are to be
                 a low-cost, low-power, high-performance engine in a
                 single-chip superscalar microprocessor. Using less than
                 15 mm$^{2}$ of the available silicon area on the chip
                 (the size of the PowerPC 603e microprocessor is 98
                 mm$^{2}$) and operating at the peak clock frequency of
                 100 MHz, an average single-pumping multiply-add-fuse
                 instruction has one-cycle throughput and four-cycle
                 latency. An average double-pumping multiply-add-fuse
                 instruction has two-cycle throughput and five-cycle
                 latency. The estimated performance at 100 MHz is 105
                 against the SPECfp92** benchmark.",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265F (Microprocessors and microcomputers); C5130
                 (Microprocessor chips); C5230 (Digital arithmetic
                 methods)",
  corpsource =   "Somerset Design Center, Motorola Inc., Austin, TX,
                 USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "add-fuse instruction; design objectives; digital
                 arithmetic; double-pumping multiply-add-fuse; floating
                 point unit; functional unit; IEEE 754 standard;
                 instruction; microprocessor chips; on-chip; peak clock
                 frequency; PowerPC 603e microprocessor; silicon area;
                 single-pumping multiply-",
  treatment =    "A Application; P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "567--??",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Nov 30 11:49:46 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pe,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "5",
  pages =        "585--??",
  month =        sep,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Nov 30 11:49:53 1996",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Judd:1996:SSA,
  author =       "I. D. Judd and P. J. Murfet and M. J. Palmer",
  title =        "{Serial Storage Architecture}",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "591--602",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-6.html#one",
  acknowledgement = ack-nhfb,
  classcodes =   "C5610P (Peripheral interfaces); C5320 (Digital
                 storage)",
  corpsource =   "IBM Storage Syst. Div., Havant, UK",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer architecture; digital storage; dual-port SSA
                 node; evaluation; hardware; high-; implementation;
                 input output devices; performance; performance serial
                 link; peripheral interfaces; Serial Storage
                 Architecture; specification; SSA",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Cheng:1996:FHR,
  author =       "J.-M. Cheng and L. M. Duyanovich and D. J. Craft",
  title =        "A fast, highly reliable data compression chip and
                 algorithm for storage systems",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "603--613",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-6.html#two",
  acknowledgement = ack-nhfb,
  classcodes =   "C5320C (Storage on moving magnetic media); C5320G
                 (Semiconductor storage)",
  corpsource =   "IBM Storage Syst. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "algorithm; data compression; data compression chip;
                 data flow analysis; data flows; graph; hardware
                 execution; IBM; IBM computers; IBMLZ1 compression;
                 magnetic disc storage; match-length distribution;
                 overhead; pattern matching; storage management chips;
                 storage systems; system-integration; vertex coloring",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Kan:1996:PPR,
  author =       "T. Kan and D. B. Lawson and O. J. Ruiz and C. F.
                 Sermon",
  title =        "The past and present roles of computer-aided
                 engineering in {DASD} design",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "615--621",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-6.html#three",
  acknowledgement = ack-nhfb,
  classcodes =   "B3120B (Magnetic recording); B0290T (Finite element
                 analysis)C7430 (Computer engineering); C5320C (Storage
                 on moving magnetic media); C4185 (Finite element
                 analysis)",
  corpsource =   "IBM Storage Syst. Div., San Jose, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "computer aided engineering; DASD design; design; FEM;
                 finite element analysis; finite element modeling;
                 head/disk assemblies; magnetic disc storage; storage
                 devices; suspension; thermal deformation problem",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Soult:1996:AVA,
  author =       "S. S. Soult",
  title =        "Architectural verification of advanced storage
                 controllers",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "623--630",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-6.html#four",
  acknowledgement = ack-nhfb,
  classcodes =   "C7430 (Computer engineering); C6110F (Formal methods);
                 C5320C (Storage on moving magnetic media)",
  corpsource =   "Abbott Labs., Abbott Critical Care Syst. Div.,
                 Mountain View, CA, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "advanced storage controllers; architectural
                 complexity; architectural verification; digital
                 simulation; direct access storage device; formal;
                 formal specification; high-performance simulator;
                 magnetic disc storage; storage management; track data;
                 TurboSim; verification",
  treatment =    "P Practical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Schlig:1996:CSC,
  author =       "E. S. Schlig",
  title =        "Charge-metering sampling circuits and their
                 applications",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "631--640",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 25 14:26:59 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd40-6.html#five",
  acknowledgement = ack-nhfb,
  classcodes =   "B1265H (A/D and D/A convertors); B7220 (Signal
                 processing and conditioning equipment and techniques);
                 B2570D (CMOS integrated circuits); C5180 (A/D and D/A
                 convertors)",
  corpsource =   "IBM Thomas J. Watson Res. Center, Yorktown Heights,
                 NY, USA",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "active matrix display; analog data line driver;
                 analogue-digital conversion; charge-metering; CMOS
                 circuit class; CMOS integrated circuits; DACs;
                 digital-; driver circuits; sampled analog data;
                 sampling circuits; signal processing equipment",
  treatment =    "T Theoretical or Mathematical",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:RPIe,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "641--??",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 6 15:09:10 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Anonymous:1996:Pf,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "40",
  number =       "6",
  pages =        "651--??",
  month =        nov,
  year =         "1996",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 6 15:09:10 MST 1997",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxlibnote =    "Issue missing from UofUtah Marriott Library",
}

@Article{Chiu:1997:OLI,
  author =       "G. L.-T. Chiu and J. M. Shaw",
  title =        "Optical lithography: {Introduction}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "3--6",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:46 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/chiu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Holmes:1997:MDL,
  author =       "S. J. Holmes and P. H. Mitchell and M. C. Hakey",
  title =        "Manufacturing with {DUV} lithography",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "7--19",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:46 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/holmes.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ausschnitt:1997:ADP,
  author =       "C. P. Ausschnitt and A. C. Thomas and T. J.
                 Wiltshire",
  title =        "Advanced {DUV} photolithography in a pilot line
                 environment",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "21--37",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:46 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/ausschnitt.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Singh:1997:HNA,
  author =       "R. N. Singh and A. E. Rosenbluth and G. L.-T. Chiu and
                 J. S. Wilczynski",
  title =        "High-numerical-aperture optical designs",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "39--48",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:47 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/singh.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rothschild:1997:LWN,
  author =       "M. Rothschild and A. R. Forte and R. R. Kunz and S. C.
                 Palmateer and J. H. C. Sedlacek",
  title =        "Lithography at a wavelength of 193 nm",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "49--55",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:47 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/rothschild.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brunner:1997:ILA,
  author =       "T. A. Brunner",
  title =        "Impact of lens aberrations on optical lithography",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "57--67",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/brunner.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ito:1997:CAR,
  author =       "H. Ito",
  title =        "Chemical amplification resists: {History} and
                 development within {IBM}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "69--80",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/ito.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shaw:1997:NPO,
  author =       "J. M. Shaw and J. D. Gelorme and N. C. LaBianca and W.
                 E. Conley and S. J. Holmes",
  title =        "Negative photoresists for optical lithography",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "81--94",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/shaw.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Allen:1997:PNL,
  author =       "R. D. Allen and G. M. Wallraff and D. C. Hofer and R.
                 R. Kunz",
  title =        "Photoresists for 193-nm lithography",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "95--104",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:49 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/allen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seeger:1997:TFI,
  author =       "D. E. Seeger and D. C. {La Tulipe, Jr.} and R. R. Kunz
                 and C. M. Garza and M. A. Hanratty",
  title =        "Thin-film imaging: {Past}, present, prognosis",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "105--118",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:49 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/seeger.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Budd:1997:DAN,
  author =       "R. A. Budd and D. B. Dove and J. L. Staples and R. M.
                 Martino and R. A. Ferguson and J. T. Weed",
  title =        "Development and application of a new tool for
                 lithographic mask evaluation, the stepper equivalent
                 {Aerial Image Measurement System}, {AIMS}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "119--129",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:50 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/budd.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Doany:1997:LFS,
  author =       "F. E. Doany and T. Ainsworth and N. Bobroff and D.
                 Goodman and A. E. Rosenbluth",
  title =        "Large-field scanning laser ablation system",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "131--142",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:50 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/doany.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Speidell:1997:MLA,
  author =       "J. L. Speidell and D. P. Pulaski and R. S. Patel",
  title =        "Masks for laser ablation technology: {New}
                 requirements and challenges",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "143--149",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:51 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/speidell.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Doany:1997:LRP,
  author =       "F. E. Doany and C. Narayan",
  title =        "Laser release process to obtain freestanding
                 multilayer metal-polyimide circuits",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "151--157",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:51 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/narayan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Biebuyck:1997:LBL,
  author =       "H. A. Biebuyck and N. B. Larsen and E. Delamarche and
                 B. Michel",
  title =        "Lithography beyond light: {Microcontact} printing with
                 monolayer resists",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "159--170",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:51 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/biebuyck.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gupta:1997:FEA,
  author =       "A. Gupta",
  title =        "Fast and effective algorithms for graph partitioning
                 and sparse-matrix ordering",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "171--183",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:52 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/gupta.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "185--??",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:37:50 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "1/2",
  pages =        "195--??",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:37:50 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/411/patents.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bose:1997:PPP,
  author =       "Pradip Bose",
  title =        "Preface: Papers on Performance Analysis and Its Impact
                 on Design",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "203--204",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  xxpages =      "204--??",
}

@Article{Kaeli:1997:PAC,
  author =       "D. R. Kaeli and L. L. Fong and R. C. Booth and K. C.
                 Imming and J. P. Weigel",
  title =        "Performance analysis on a {CC-NUMA} prototype",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "205--214",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/kaeli.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Emma:1997:USS,
  author =       "P. G. Emma",
  title =        "Understanding some simple processor-performance
                 limits",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "215--232",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/emma.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sarkar:1997:ASH,
  author =       "V. Sarkar",
  title =        "Automatic selection of high-order transformations in
                 the {IBM XL FORTRAN} compilers",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "233--264",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/sarkar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Charney:1997:PMS,
  author =       "M. J. Charney and T. R. Puzak",
  title =        "Prefetching and memory system behavior of the {SPEC95}
                 benchmark suite",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "265--286",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/charney.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Moreno:1997:SEE,
  author =       "J. H. Moreno and M. Moudgill and K. Ebcioglu and E.
                 Altman and C. B. Hall and R. Miranda and S.-K. Chen and
                 A. Polyak",
  title =        "Simulation\slash evaluation environment for a {VLIW}
                 processor architecture",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "287--302",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/moreno.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Moreira:1997:DRM,
  author =       "J. E. Moreira and V. K. Naik",
  title =        "Dynamic resource management on distributed systems
                 using reconfigurable applications",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "303--330",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/moreira.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sandon:1997:NBD,
  author =       "P. A. Sandon and Y.-C. Liao and T. E. Cook and D. M.
                 Schultz and P. Martin-de-Nicolas",
  title =        "{NStrace}: a bus-driven instruction trace tool for
                 {PowerPC} microprocessors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "331--344",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/sandon.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Levine:1997:PVP,
  author =       "F. E. Levine and C. P. Roth",
  title =        "A programmer's view of performance monitoring in the
                 {PowerPC} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "345--356",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/levine.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bournas:1997:OTS,
  author =       "R. M. Bournas",
  title =        "Optimization of {TCP} segment size for file transfer",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "357--366",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/bournas.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "367--??",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:37:50 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "3",
  pages =        "379--??",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:37:50 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/413/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mauri:1997:PIG,
  author =       "Ross A. Mauri",
  title =        "Preface: {IBM S/390} {G3} and {G4}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "395--396",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rao:1997:IPE,
  author =       "G. S. Rao and T. A. Gregg and C. A. Price and C. L.
                 Rao and S. J. Repka",
  title =        "{IBM S/390 Parallel Enterprise Servers G3} and {G4}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "397--403",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/rao.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Doettling:1997:PES,
  author =       "G. Doettling and K. J. Getzlaff and B. Leppla and W.
                 Lipponer and T. Pflueger and T. Schlipf and D.
                 Schmunkamp and U. Wille",
  title =        "{S/390 Parallel Enterprise Server Generation 3}: a
                 balanced system and cache structure",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "405--428",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/doettling.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mak:1997:SCC,
  author =       "P. Mak and M. A. Blake and C. C. Jones and G. E.
                 Strait and P. R. Turgeon",
  title =        "Shared-cache clusters in a system with a fully shared
                 memory",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "429--448",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/mak.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gregg:1997:CSC,
  author =       "T. A. Gregg",
  title =        "{S/390 CMOS} server {I/O}: The continuing evolution",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "449--462",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/gregg.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webb:1997:HFC,
  author =       "C. F. Webb and J. S. Liptay",
  title =        "A high-frequency custom {CMOS S/390} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "463--473",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/webb.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schwarz:1997:CFP,
  author =       "E. M. Schwarz and L. Sigal and T. J. McPherson",
  title =        "{CMOS} floating-point unit for the {S/390 Parallel
                 Enterprise Server G4}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "475--488",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/schwarz.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sigal:1997:CDT,
  author =       "L. Sigal and J. D. Warnock and B. W. Curran and Y. H.
                 Chan and P. J. Camporese and M. D. Mayo and W. V. Huott
                 and D. R. Knebel and C. T. Chuang and J. P. Eckhardt
                 and P. T. Wu",
  title =        "Circuit design techniques for the high-performance
                 {CMOS IBM S/390 Parallel Enterprise Server G4}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "489--503",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:10:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/sigal.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kick:1997:SCB,
  author =       "B. Kick and U. Baur and J. Koehl and T. Ludwig and T.
                 Pflueger",
  title =        "Standard-cell-based design methodology for
                 high-performance support chips",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "505--514",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/kick.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shepard:1997:DMP,
  author =       "K. L. Shepard and S. M. Carey and E. K. Cho and B. W.
                 Curran and R. F. Hatch and D. E. Hoffman and S. A.
                 McCabe and G. A. Northrop and R. Seigler",
  title =        "Design methodology for the {S/390 Parallel Enterprise
                 Server G4} microprocessors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "515--547",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/shepard.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wile:1997:FVC,
  author =       "B. Wile and M. P. Mullen and C. Hanson and D. G. Bair
                 and K. M. Lasko and P. J. Duffy and E. J. {Kaminski,
                 Jr.} and T. E. Gilbert and S. M. Licker and R. G.
                 Sheldon and W. D. Wollyung and W. J. Lewis and R. J.
                 Adkins",
  title =        "Functional verification of the {CMOS S/390 Parallel
                 Enterprise Server G4} system",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "549--566",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/mullen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schlipf:1997:FVM,
  author =       "T. Schlipf and T. Buechner and R. Fritz and M. Helms
                 and J. Koehl",
  title =        "Formal verification made easy",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "567--576",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/schlipf.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koerner:1997:RCS,
  author =       "S. Koerner and S. M. Licker",
  title =        "Run-control and service element code simulation for
                 the {S/390} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "577--580",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/koerner.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wile:1997:DLV,
  author =       "B. Wile",
  title =        "Designer-level verification using {TIMEDIAG/GENRAND}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "581--591",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/wile.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{VanHuben:1997:RTC,
  author =       "Gary A. {Van Huben}",
  title =        "The role of two-cycle simulation in the {S/390}
                 verification process",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "593--599",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/vanhuben.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hallock:1997:SCP,
  author =       "G. G. Hallock and E. J. {Kaminski, Jr.} and K. M.
                 Lasko and M. P. Mullen",
  title =        "{SimAPI} --- a common programming interface for
                 simulation",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "601--610",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/hallock.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Huott:1997:AMT,
  author =       "W. V. Huott and T. J. Koprowski and B. J. Robbins and
                 M. P. Kusko and S. V. Pateras and D. E. Hoffman and T.
                 G. McNamara and T. J. Snethen",
  title =        "Advanced microprocessor test strategy and
                 methodology",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "611--627",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/huott.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "629--637",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "4/5",
  pages =        "641--??",
  month =        "????",
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:37:50 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/414/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zable:1997:OIP,
  author =       "J. L. Zable and H.-C. Lee",
  title =        "An overview of impact printing",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "651--668",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/zable.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stanich:1997:PQE,
  author =       "M. J. Stanich",
  title =        "Print-quality enhancement in electrophotographic
                 printers",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "669--678",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/stanich.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mastie:1997:UTE,
  author =       "S. D. Mastie",
  title =        "Use of the transform exit sequence in printing and as
                 a framework for the solution of complex problems",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "679--692",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/mastie.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bassok:1997:DCS,
  author =       "Y. Bassok and A. Bixby and R. Srinivasan and H. Z.
                 Wiesel",
  title =        "Design of component-supply contract with
                 commitment-revision flexibility",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "693--703",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:05 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/bassok.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Glaise:1997:TSC,
  author =       "R. J. Glaise",
  title =        "A two-step computation of cyclic redundancy code
                 {CRC-32} for {ATM} networks",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "705--709",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:05 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/glaise.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Toledo:1997:IMS,
  author =       "S. Toledo",
  title =        "Improving the memory-system performance of
                 sparse-matrix vector multiplication",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "711--725",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/toledo.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Alfonseca:1997:SRF,
  author =       "M. Alfonseca and A. Ortega",
  title =        "A study of the representation of fractal curves by
                 {$L$} systems and their equivalences",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "727--736",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/alfonseca.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gustavson:1997:RLA,
  author =       "F. G. Gustavson",
  title =        "Recursion leads to automatic variable blocking for
                 dense linear-algebra algorithms",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "737--755",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/gustavson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "757--??",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:31:52 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:Pd,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "769--??",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:31:52 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:AIV,
  author =       "Anonymous",
  title =        "Author index for {Volume 41}",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "775--??",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:31:52 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/authv41.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1997:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 41",
  journal =      j-IBM-JRD,
  volume =       "41",
  number =       "6",
  pages =        "779--??",
  month =        nov,
  year =         "1997",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Mar 25 09:31:52 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/416/subjv41.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Parkin:1998:MMM,
  author =       "S. S. P. Parkin",
  title =        "The magic of magnetic multilayers: Introduction to
                 this group of papers",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "3--6",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/parkin.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Allenspach:1998:OMP,
  author =       "R. Allenspach and W. Weber",
  title =        "Oscillatory magnetic properties",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "7--24",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/allenspach.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jones:1998:TEC,
  author =       "B. A. Jones",
  title =        "Theory of exchange coupling in magnetic multilayers",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "25--31",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/jones.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Himpsel:1998:ESM,
  author =       "F. J. Himpsel and T. A. Jung and P. F. Seidler",
  title =        "Electronic states in magnetic nanostructures",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "33--42",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/himpsel.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Farrow:1998:RMB,
  author =       "R. F. C. Farrow",
  title =        "The role of molecular beam epitaxy in research on
                 giant magnetoresistance and interlayer exchange
                 coupling",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "43--52",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/farrow.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nesbet:1998:TSD,
  author =       "R. K. Nesbet",
  title =        "Theory of spin-dependent conductivity in {GMR}
                 materials",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "53--71",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/nesbet.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stohr:1998:MPT,
  author =       "J. Stohr and R. Nakajima",
  title =        "Magnetic properties of transition-metal multilayers
                 studied with {X}-ray magnetic circular dichroism
                 spectroscopy",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "73--89",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/stohr.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sun:1998:MDM,
  author =       "J. Z. Sun and L. Krusin-Elbaum and A. Gupta and Gang
                 Xiao and P. R. Duncombe and S. S. P. Parkin",
  title =        "Magnetotransport in doped manganate perovskites",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "89--102",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:10 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/sun.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tsang:1998:DFP,
  author =       "C. H. Tsang and R. E. {Fontana, Jr.} and T. Lin and D.
                 E. Heim and B. A. Gurney and M. L. Williams",
  title =        "Design, fabrication, and performance of spin-valve
                 read heads for magnetic recording applications",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "103--116",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:10 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/tsang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ziegler:1998:TCR,
  author =       "J. F. Ziegler",
  title =        "Terrestrial cosmic ray intensities",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "117--139",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:11 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/ziegler.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "141--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "1",
  pages =        "151--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/421/patents.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dan:1998:PMS,
  author =       "A. Dan and S. I. Feldman and D. N. Serpanos",
  title =        "Preface: Multimedia Systems",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "162--163",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Flynn:1998:MI,
  author =       "R. J. Flynn and W. H. Tetzlaff",
  title =        "Multimedia --- An introduction",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "165--176",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:12 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/flynn.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dan:1998:ECM,
  author =       "A. Dan and S. I. Feldman and an D. N. Serpanos",
  title =        "Evolution and challenges in multimedia",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "177--184",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:12 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/dan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haskin:1998:TSS,
  author =       "R. L. Haskin",
  title =        "{Tiger Shark} --- a scalable file system for
                 multimedia",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "185--197",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/haskin.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanuki:1998:DVS,
  author =       "T. Sanuki and Y. Asakawa",
  title =        "Design of a video-server complex for interactive
                 television",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "199--218",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/sanuki.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kumar:1998:VSD,
  author =       "M. Kumar",
  title =        "Video-server designs for supporting very large numbers
                 of concurrent users",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "219--232",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/kumar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bolle:1998:VQR,
  author =       "R. M. Bolle and B.-L. Yeo and M. M. Yeung",
  title =        "Video query: Research directions",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "233--252",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:14 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/bolle.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Castelli:1998:PSR,
  author =       "V. Castelli and L. D. Bergman and I. Kontoyiannis and
                 C.-S. Li and J. T. Robinson and J. J. Turek",
  title =        "Progressive search and retrieval in large image
                 archives",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "253--268",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:14 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/castelli.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Willebeek-LeMair:1998:BAV,
  author =       "M. H. Willebeek-LeMair and K. G. Kumar and E. C.
                 Snible",
  title =        "{Bamba} --- {Audio} and video streaming over the
                 {Internet}",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "269--280",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:15 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/willebeek.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bisdikian:1998:MDC,
  author =       "C. Bisdikian and S. Brady and Y. N. Doganata and D. A.
                 Foulger and F. Marconcini and M. Mourad and H. L.
                 Operowsky and G. Pacifici and A. N. Tantawi",
  title =        "{MultiMedia} Digital Conferencing: a {Web}-enabled
                 multimedia teleconferencing system",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "281--298",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:15 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/bisdikian.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "299--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "2",
  pages =        "305--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/422/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Alt:1998:IED,
  author =       "P. M. Alt and K. Noda",
  title =        "Increasing electronic display information content: An
                 introduction",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "315--320",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:15 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/alt.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Melcher:1998:DFP,
  author =       "R. L. Melcher and P. M. Alt and D. B. Dove and T. M.
                 Cipolla and E. G. Colgan and F. E. Doany and K. Enami
                 and K. C. Ho and I. Lovas and C. Narayan and R. S.
                 {Olyha, Jr.} and C. G. Powell and A. E. Rosenbluth and
                 J. L. Sanford and E. S. Schlig and R. N. Singh and T.
                 Tomooka and M. Uda and K. H. Yang",
  title =        "Design and fabrication of a prototype projection data
                 monitor with high information content",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "321--338",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:16 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See addendum \cite{Melcher:1998:ADF}.",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/melcher.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Colgan:1998:CML,
  author =       "E. G. Colgan and M. Uda",
  title =        "On-chip metallization layers for reflective light
                 valves",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "339--345",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:16 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/colgan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanford:1998:SLV,
  author =       "J. L. Sanford and E. S. Schlig and T. Tomooka and K.
                 Enami and F. R. Libsch",
  title =        "Silicon light-valve array chip for high-resolution
                 reflective liquid crystal projection displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "347--358",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:17 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See addendum \cite{Sanford:1998:ASL}.",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/sanford.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rosenbluth:1998:CPR,
  author =       "A. E. Rosenbluth and D. B. Dove and F. E. Doany and R.
                 N. Singh and K. H. Yang and M. Lu",
  title =        "Contrast properties of reflective liquid crystal light
                 valves in projection displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "359--386",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:17 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/rosenbluth.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Doany:1998:PDT,
  author =       "F. E. Doany and R. N. Singh and A. E. Rosenbluth and
                 G. L.-T. Chiu",
  title =        "Projection display throughput: Efficiency of optical
                 transmission and light-source collection",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "387--399",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:17 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/doany.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yang:1998:NLM,
  author =       "K. H. Yang and M. Lu",
  title =        "Nematic {LC} modes and {LC} phase gratings for
                 reflective spatial light modulators",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "401--410",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:18 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/yang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanford:1998:OMR,
  author =       "J. L. Sanford and P. F. Greier and K. H. Yang and M.
                 Lu and R. S. {Olyha, Jr.} and C. Narayan and J. A.
                 Hoffnagle and P. M. Alt and R. L. Melcher",
  title =        "A one-megapixel reflective spatial light modulator
                 system for holographic storage",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "411--426",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:18 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/greier.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Colgan:1998:DSA,
  author =       "E. G. Colgan and P. M. Alt and R. L. Wisnieff and P.
                 M. Fryer and E. A. Galligan and W. S. Graham and P. F.
                 Greier and R. R. Horton and H. Ifill and L. C. Jenkins
                 and R. A. John and R. I. Kaufman and Y. Kuo and A. P.
                 Lanzetta and K. F. Latzko and F. R. Libsch and S.-C. A.
                 Lien and S. E. Millman and R. W. Nywening and R. J.
                 Polastre and C. G. Powell and R. A. Rand and J. J.
                 Ritsko and M. B. Rothwell and J. L. Staples and K. W.
                 Warren and J. S. Wilson and S. L. Wright",
  title =        "A 10.5-in.-diagonal {SXGA} active-matrix display",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "427--444",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:19 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/wisnieff.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wright:1998:ALR,
  author =       "S. L. Wright and K. W. Warren and P. M. Alt and R. R.
                 Horton and C. Narayan and P. F. Greier and M. Kodate",
  title =        "Active line repair for thin-film-transistor liquid
                 crystal displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "445--457",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:19 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/wright.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kusafuka:1998:DMG,
  author =       "K. Kusafuka and H. Shimizu and S. Kimura",
  title =        "Driving method for gate-delay compensation of
                 {TFT/LCD}",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "459--466",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:20 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/kusafuka.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Libsch:1998:UCH,
  author =       "F. R. Libsch and S.-C. A. Lien",
  title =        "Understanding crosstalk in high-resolution color
                 thin-film-transistor liquid crystal displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "467--479",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:20 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/libsch.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Colgan:1998:TFT,
  author =       "E. G. Colgan and R. J. Polastre and M. Takeichi and R.
                 L. Wisnieff",
  title =        "Thin-film-transistor process-characterization test
                 structures",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "481--490",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:21 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/polastre.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arai:1998:ABG,
  author =       "T. Arai and H. Iiyori and Y. Hiromasu and M. Atsumi
                 and S. Ioku and K. Furuta",
  title =        "Aluminum-based gate structure for active-matrix liquid
                 crystal displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "491--499",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:21 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/arai.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Takatsuji:1998:EAN,
  author =       "H. Takatsuji and E. G. Colgan and C. {Cabral, Jr.} and
                 J. M. E. Harper",
  title =        "Evaluation of {Al(Nd)}-alloy films for application to
                 thin-film-transistor liquid crystal displays",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "501--508",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:21 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/takatsuji.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tsuji:1998:ACS,
  author =       "S. Tsuji and K. Tsujimoto and H. Iwama",
  title =        "Application of cross-sectional transmission electron
                 microscopy to thin-film-transistor failure analysis",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "509--516",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:22 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/tsuji.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nishida:1998:MCU,
  author =       "H. Nishida and K. Sakamoto and Hideki Ogawa and Hiromi
                 Ogawa",
  title =        "Micropitch connection using anisotropic conductive
                 materials for driver {IC} attachment to a liquid
                 crystal display",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "517--525",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:22 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/nishida.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tanase:1998:NBS,
  author =       "H. Tanase and J. Mamiya and M. Suzuki",
  title =        "A new backlighting system using a polarizing light
                 pipe",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "527--536",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:23 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/tanase.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lien:1998:AMD,
  author =       "S.-C. A. Lien and P. Chaudhari and J. A. Lacey and R.
                 A. John and J. L. Speidell",
  title =        "Active-matrix display using ion-beam-processed
                 polyimide film for liquid crystal alignment",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "537--542",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:23 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/lien.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "543--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "3/4",
  pages =        "553--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/423/patents.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Datta:1998:AEM,
  author =       "M. Datta",
  title =        "Applications of electrochemical microfabrication: An
                 introduction",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "563--566",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:24 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/intro.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andricacos:1998:DCE,
  author =       "C. Andricacos and C. Uzoh and J. O. Dukovic and J.
                 Horkans and H. Deligianni",
  title =        "{Damascene} copper electroplating for chip
                 interconnections",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "567--574",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:24 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/andricacos.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Krongelb:1998:EPA,
  author =       "S. Krongelb and L. T. Romankiw and J. A. Tornello",
  title =        "Electrochemical process for advanced package
                 fabrication",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "575--585",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:24 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/krongelb.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wong:1998:MPH,
  author =       "K. K. H. Wong and S. Kaja and P. W. DeHaven",
  title =        "Metallization by plating for high-performance
                 multichip modules",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "587--596",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:25 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/wong.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Perfecto:1998:TFM,
  author =       "E. D. Perfecto and A. P. Giri and R. R. Shields and H.
                 P. Longworth and J. R. Pennacchia and M. P. Jeanneret",
  title =        "Thin-film multichip module packages for high-end {IBM}
                 servers",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "597--606",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:25 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/perfecto.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{OSullivan:1998:EDD,
  author =       "E. J. O'Sullivan and A. G. Schrott and M. Paunovic and
                 C. J. Sambucetti and J. R. Marino and P. J. Bailey and
                 S. Kaja and K. W. Semkow",
  title =        "Electrolessly deposited diffusion barriers for
                 microelectronics",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "607--620",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:26 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/osullivan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Horkans:1998:PMM,
  author =       "J. Horkans",
  title =        "Polarographic methods of monitoring addition agents in
                 the electroplating of {Sn-Pb} solders",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "621--628",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:26 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/horkans.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kohl:1998:PES,
  author =       "P. A. Kohl",
  title =        "Photoelectrochemical etching of semiconductors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "629--637",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:26 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/kohl.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{vonGutfeld:1998:EML,
  author =       "R. J. {von Gutfeld} and K. G. Sheppard",
  title =        "Electrochemical microfabrication by laser-enhanced
                 photothermal processes",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "639--653",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:27 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/vongutfeld.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Datta:1998:MEM,
  author =       "M. Datta",
  title =        "Microfabrication by electrochemical metal removal",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "655--669",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:27 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/datta.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andricacos:1998:FDE,
  author =       "P. C. Andricacos and N. Robertson",
  title =        "Future directions in electroplated materials for
                 thin-film recording heads",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "671--680",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:28 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/robertson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{OSullivan:1998:IVR,
  author =       "E. J. O'Sullivan and E. I. Cooper and L. T. Romankiw
                 and K. T. Kwietniak and P. L. Trouilloud and J. Horkans
                 and C. V. Jahnes and I. V. Babich and S. Krongelb and
                 S. G. Hegde and J. A. Tornello and N. C. LaBianca and
                 J. M. Cotte and T. J. Chainer",
  title =        "Integrated, variable-reluctance magnetic minimotor",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "681--694",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:28 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/cooper.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "695--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/recentpub.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:Pd,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "5",
  pages =        "711--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 25 11:12:23 MST 1998",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/425/patents.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Burroughs:1998:DCT,
  author =       "S. H. Burroughs and T. R. Lattrell",
  title =        "Data compression technology in {ASIC} cores",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "725--731",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:29 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/burroughs.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Craft:1998:FHD,
  author =       "D. J. Craft",
  title =        "A fast hardware data compression algorithm and some
                 algorithmic extensions",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "733--745",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:29 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/craft.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Slattery:1998:DCA,
  author =       "M. J. Slattery and F. A. Kampf",
  title =        "Design considerations for the {ALDC} cores",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "747--752",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:29 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/slattery.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marks:1998:JAC,
  author =       "K. M. Marks",
  title =        "A {JBIG-ABIC} compression engine for digital document
                 processing",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "753--758",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:30 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/marks.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kampf:1998:PFC,
  author =       "F. A. Kampf",
  title =        "Performance as a function of compression",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "759--766",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:30 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/kampf.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Slattery:1998:QC,
  author =       "M. J. Slattery and J. L. Mitchell",
  title =        "The {Qx}-coder",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "767--784",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:30 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/mitchell.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Colyer:1998:IJA,
  author =       "P. S. Colyer and J. L. Mitchell",
  title =        "The {IBM JBIG-ABIC Verification Suite}",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "785--794",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:31 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/colyer.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1998:IMS,
  author =       "R. E. Anderson and E. M. Foster and D. E. Franklin and
                 R. S. Svec",
  title =        "Integrating the {MPEG-2} subsystem for digital
                 television",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "795--806",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:31 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/anderson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kemp:1998:DCP,
  author =       "T. M. Kemp and R. K. Montoye and J. D. Harper and J.
                 D. Palmer and D. J. Auerbach",
  title =        "A decompression core for {PowerPC}",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "807--812",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:32 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/kemp.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Matick:1998:MNM,
  author =       "R. E. Matick",
  title =        "Modular nets ({MNETS}): a modular design methodology
                 for computer timers",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "813--830",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:32 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/matick.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:RPIe,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "831--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:Pe,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "839--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 42",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "861--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/authv42.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1998:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 42",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "867--??",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/subjv42.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Melcher:1998:ADF,
  author =       "R. L. Melcher and R. R. Horton and H. Ifill",
  title =        "Addendum: Design and Fabrication of a Prototype
                 Projection Data Monitor with High Information-Content
                 (Vol 42, Pg 321, 1998)",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "874--874",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  note =         "See \cite{Melcher:1998:DFP}.",
  URL =          "http://www.almaden.ibm.com/journal/rd/426/addenda.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanford:1998:ASL,
  author =       "J. L. Sanford and H. S. P. Wong",
  title =        "Addendum: Silicon Light-Valve Array Chip for
                 High-Resolution Reflective Liquid-Crystal Projection
                 Displays (Vol 42, Pg 347, 1998)",
  journal =      j-IBM-JRD,
  volume =       "42",
  number =       "6",
  pages =        "874--874",
  month =        "????",
  year =         "1998",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  note =         "See \cite{Sanford:1998:SLV}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  journalabr =   "IBM J Res Develop",
}

@Article{Kuo:1999:PPP,
  author =       "Y. Kuo",
  title =        "Preface: Papers on Plasma Processing",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "3--4",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 Science Citation Index database (1980--date)",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cote:1999:PAC,
  author =       "D. R. Cote and S. V. Nguyen and A. K. Stamper and D.
                 S. Armbrust and D. Tobben and R. A. Conti and G. Y.
                 Lee",
  title =        "Plasma-assisted chemical vapor deposition of
                 dielectric thin films for {ULSI} semiconductor
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "5--38",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:34 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/cote.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Armacost:1999:PEP,
  author =       "M. Armacost and P. D. Hoh and R. Wise and W. Yan and
                 J. J. Brown and J. H. Keller and G. A. Kaplita and S.
                 D. Halle and K. P. Muller and M. D. Naeem and S.
                 Srinivasan and H. Y. Ng and M. Gutsche and A. Gutmann
                 and B. Spuler",
  title =        "Plasma-etching processes for {ULSI} semiconductor
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "39--72",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:34 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/armacost.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kuo:1999:PPF,
  author =       "Y. Kuo and M. Okajima and M. Takeichi",
  title =        "Plasma processing in the fabrication of amorphous
                 silicon thin-film-transistor arrays",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "73--88",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:35 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/kuo.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hsiao:1999:FMR,
  author =       "R. Hsiao",
  title =        "Fabrication of magnetic recording heads and dry
                 etching of head materials",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "89--102",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:35 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/hsiao.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fonash:1999:PPD,
  author =       "S. J. Fonash",
  title =        "Plasma processing damage in etching and deposition",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "103--107",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:36 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/fonash.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nguyen:1999:HDP,
  author =       "S. V. Nguyen",
  title =        "High-density plasma chemical vapor deposition of
                 silicon-based dielectric films for integrated
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "109--126",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:36 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/nguyen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hess:1999:PAO,
  author =       "D. W. Hess",
  title =        "Plasma-assisted oxidation, anodization, and
                 nitridation of silicon",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "127--145",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:36 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/hess.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Grill:1999:PDD,
  author =       "A. Grill",
  title =        "Plasma-deposited diamondlike carbon and related
                 materials",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "147--161",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:37 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/grill.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rossnagel:1999:SDS,
  author =       "S. M. Rossnagel",
  title =        "Sputter deposition for semiconductor manufacturing",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "163--179",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:37 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/rossnagel.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Oehrlein:1999:SSI,
  author =       "G. S. Oehrlein and M. F. Doemling and B. E. E.
                 Kastenmeier and P. J. Matsuo and N. R. Rueger and M.
                 Schaepkens and T. E. F. M. Standaert",
  title =        "Surface science issues in plasma etching",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "181--197",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:38 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/oehrlein.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hamaguchi:1999:MSM,
  author =       "S. Hamaguchi",
  title =        "Modeling and simulation methods for plasma
                 processing",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "199--215",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:38 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/hamaguchi.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "217--??",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "1/2",
  pages =        "227--??",
  month =        "????",
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 15 11:22:36 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.almaden.ibm.com/journal/rd/431/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buchanan:1999:PPU,
  author =       "D. A. Buchanan",
  title =        "Preface: Papers on Ultrathin Dielectric Films",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "243--244",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buchanan:1999:SGD,
  author =       "D. A. Buchanan",
  title =        "Scaling the gate dielectric: Materials, integration,
                 and reliability",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "245--264",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:39 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/buchanan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gusev:1999:GCU,
  author =       "E. P. Gusev and H.-C. Lu and E. L. Garfunkel and T.
                 Gustafsson and M. L. Green",
  title =        "Growth and characterization of ultrathin nitrided
                 silicon oxide films",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "265--286",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:39 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/gusev.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ellis:1999:NON,
  author =       "K. A. Ellis and R. A. Buhrman",
  title =        "Nitrous oxide ({N$_2$O}) processing for silicon
                 oxynitride gate dielectrics",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "287--300",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:40 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/ellis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lucovsky:1999:UNG,
  author =       "G. Lucovsky",
  title =        "Ultrathin nitrided gate dielectrics: Plasma
                 processing, chemical characterization, performance, and
                 reliability",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "301--326",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:40 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/lucovsky.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lo:1999:MCQ,
  author =       "S.-H. Lo and D. A. Buchanan and Y. Taur",
  title =        "Modeling and characterization of quantization,
                 polysilicon depletion, and direct tunneling effects in
                 {MOSFETs} with ultrathin oxides",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "327--337",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:41 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/lo.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Heyns:1999:CEC,
  author =       "M. M. Heyns and T. Bearda and I. Cornelissen and S.
                 {De Gendt} and R. Degraeve and G. Groeseneken and
                 C. Kenens and D. M. Knotter and L. M. Loewenstein and
                 P. W. Mertens and S. Mertens and M. Meuris and T. Nigam
                 and M. Schaekers and I. Teerlinck and W. Vandervorst
                 and R. Vos and K. Wolke",
  title =        "Cost-effective cleaning and high-quality thin gate
                 oxides",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "339--350",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:41 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/heyns.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Okorn-Schmidt:1999:CSS,
  author =       "H. F. Okorn-Schmidt",
  title =        "Characterization of silicon surface preparation
                 processes for advanced gate dielectrics",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "351--366",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:42 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/okorn.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kotecki:1999:BST,
  author =       "D. E. Kotecki and J. D. Baniecki and H. Shen and R. B.
                 Laibowitz and K. L. Saenger and J. J. Lian and T. M.
                 Shaw and S. D. Athavale and C. {Cabral, Jr.} and P. R.
                 Duncombe and M. Gutsche and G. Kunkel and Y.-J. Park
                 and Y.-Y. Wang and R. Wise",
  title =        "{(Ba,Sr)TiO$_3$} dielectrics for future
                 stacked-capacitor {DRAM}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "367--380",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:42 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/kotecki.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Campbell:1999:TDT,
  author =       "S. A. Campbell and H.-S. Kim and D. C. Gilmer and B.
                 He and T. Ma and W. L. Gladfelter",
  title =        "Titanium dioxide ({TiO$_2$})-based gate insulators",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "383--392",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:42 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/campbell.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hook:1999:NGO,
  author =       "T. B. Hook and J. S. Burnham and R. J. Bolam",
  title =        "Nitrided gate oxides for {3.3-V} logic application:
                 Reliability and device design considerations",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "393--406",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:43 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/hook.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abadeer:1999:KMU,
  author =       "W. W. Abadeer and A. Bagramian and D. W. Conkle and C.
                 W. Griffin and E. Langlois and B. F. Lloyd and R. P.
                 Mallette and J. E. Massucco and J. M. McKenna and S. W.
                 Mittl and P. H. Noel",
  title =        "Key measurements of ultrathin gate dielectric
                 reliability and in-line monitoring",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "407--416",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:43 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/abadeer.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "417--??",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 17 16:34:50 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:PP,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "3",
  pages =        "431--??",
  month =        may,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 17 16:34:50 MDT 1999",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd43-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/433/patents.txt",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gonzales:1999:PMT,
  author =       "Cesar A. Gonzales",
  title =        "Preface: Multimedia Technologies in {IBM}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "450--452",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gonzales:1999:RME,
  author =       "C. A. Gonzales and H. Yeo and C. J. Kuo",
  title =        "Requirements for motion-estimation search range in
                 {MPEG-2} coded video",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "453--470",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:44 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/gonzales.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Westerink:1999:TPM,
  author =       "P. H. Westerink and R. Rajagopalan and C. A.
                 Gonzales",
  title =        "Two-pass {MPEG-2} variable-bit-rate encoding",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "471--488",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:45 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/westerink.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mohsenian:1999:SPC,
  author =       "N. Mohsenian and R. Rajagopalan and C. A. Gonzales",
  title =        "Single-pass constant- and variable-bit-rate {MPEG-2}
                 video compression",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "489--509",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:45 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/mohsenian.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boroczky:1999:SMU,
  author =       "L. B{\"o}r{\"o}czky and A. Y. Ngai and E. F.
                 Westermann",
  title =        "Statistical multiplexing using {MPEG-2} video
                 encoders",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "511--520",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:45 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/boroczky.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:1999:DMT,
  author =       "R. E. Anderson and E. M. Foster",
  title =        "Design of an {MPEG-2} transport demultiplexor core",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "521--532",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:46 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/anderson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reed:1999:PVE,
  author =       "C. A. Reed and D. J. Thygesen",
  title =        "Pseudorandom verification and emulation of an {MPEG-2}
                 transport demultiplexor",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "533--544",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:46 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/reed.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lam:1999:MRH,
  author =       "W.-M. Lam and L. Lu",
  title =        "Memory reduction for {HDTV} decoders",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "545--553",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:47 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/lam.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Manohar:1999:FPO,
  author =       "N. R. Manohar and A. Mehra and M. H. Willebeek-LeMair
                 and M. Naghshineh",
  title =        "A framework for programmable overlay multimedia
                 networks",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "555--577",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 18:18:25 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/manohar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hilgendorf:1999:EBP,
  author =       "R. B. Hilgendorf and G. J. Heim and W. Rosenstiel",
  title =        "Evaluation of branch-prediction methods on traces from
                 commercial applications",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "579--593",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/hilgendorf.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "595--601",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "4",
  pages =        "603--617",
  month =        jul,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:48 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/434/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Carswell:1999:PPI,
  author =       "Kevin Carswell and Cyril Price",
  title =        "Preface: Papers on {IBM S/390 Server G5\slash G6}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "619--620",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:05 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Katopis:1999:MTD,
  author =       "G. A. Katopis and W. D. Becker and T. R. Mazzawy and
                 H. H. Smith and C. K. Vakirtzis and S. A. Kuppinger and
                 B. Singh and P. C. Lin and J. {Bartells, Jr.} and G. V.
                 Kihlmire and P. N. Venkatachalam and H. I. Stoller and
                 J. L. Frankel",
  title =        "{MCM} technology and design for the {S/390 G5}
                 systems",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "621--650",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/katopis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rizzolo:1999:SPM,
  author =       "R. F. Rizzolo and G. Hinkel and S. Michnowski and T.
                 J. McPherson and A. J. Sutcliffe",
  title =        "System performance management for the {S/390 Parallel
                 Enterprise Server G5}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "651--660",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/rizzolo.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Turgeon:1999:GGB,
  author =       "P. R. Turgeon and P. Mak and M. A. Blake and M. F. Fee
                 and C. B. {Ford III} and P. J. Meaney and R. Seigler
                 and W. W. Shen",
  title =        "The {S/390 G5\slash G6} binodal cache",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "661--670",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/turgeon.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Check:1999:CGG,
  author =       "M. A. Check and T. J. Slegel",
  title =        "Custom {S/390 G5} and {G6} microprocessors",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "671--680",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/check.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Averill:1999:CIM,
  author =       "R. M. {Averill III} and K. G. Barkley and M. A. Bowen
                 and P. J. Camporese and A. H. Dansky and R. F. Hatch
                 and D. E. Hoffman and M. D. Mayo and S. A. McCabe and
                 T. G. McNamara and T. J. McPherson and G. A. Northrop
                 and L. Sigal and H. H. Smith and D. A. Webber and P. M.
                 Williams",
  title =        "Chip integration methodology for the {IBM S/390 G5}
                 and {G6} custom microprocessors",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "681--706",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/averill.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schwarz:1999:GFP,
  author =       "E. M. Schwarz and C. A. Krygowski",
  title =        "The {S/390 G5} floating-point unit",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "707--721",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.435.0707",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/schwarz.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abbott:1999:ASS,
  author =       "P. H. Abbott and D. G. Brush and C. W. {Clark III} and
                 C. J. Crone and J. R. Ehrman and G. W. Ewart and C. A.
                 Goodrich and M. Hack and J. S. Kapernick and B. J.
                 Minchau and W. C. Shepard and R. M. {Smith, Sr.} and R.
                 Tallman and S. Walkowiak and A. Watanabe and W. R.
                 White",
  title =        "Architecture and software support in {IBM S/390
                 Parallel Enterprise Servers} for {IEEE} Floating-Point
                 arithmetic",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "723--760",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.435.0723",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 03 07:08:45 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/fparith.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Besides important history of the development of the
                 S/360 floating-point architecture, this paper has a
                 good description of IBM's algorithm for exact
                 decimal-to-binary conversion, complementing earlier
                 ones
                 \cite{Steele:1990:HPF,Clinger:1990:HRF,Knuth:1990:SPW,Burger:1996:PFP}.",
  URL =          "http://www.research.ibm.com/journal/rd/435/abbott.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Easter:1999:PES,
  author =       "R. J. Easter and E. W. Chencinski and E. J. D'Avignon
                 and S. R. Greenspan and W. A. Merz and C. D. Norberg",
  title =        "{S/390 Parallel Enterprise Server CMOS} Cryptographic
                 Coprocessor",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "761--776",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/easter.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yeh:1999:CCC,
  author =       "P. C. Yeh and R. M. {Smith, Sr.}",
  title =        "{S/390 CMOS} Cryptographic Coprocessor Architecture:
                 Overview and design considerations",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "777--794",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Mar 06 15:45:29 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/yeh.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gregg:1999:ICB,
  author =       "T. A. Gregg and K. M. Pandey and R. K. Errickson",
  title =        "The Integrated Cluster Bus for the {IBM S/390 Parallel
                 Sysplex}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "795--806",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/gregg.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{DeCusatis:1999:FOI,
  author =       "C. M. DeCusatis and D. J. {Stigliani, Jr.} and W. L.
                 Mostowy and M. E. Lewis and D. B. Petersen and N. R.
                 Dhondy",
  title =        "Fiber optic interconnects for the {IBM S/390 Parallel
                 Enterprise Server G5}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "807--828",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/decusatis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hoke:1999:STI,
  author =       "J. M. Hoke and P. W. Bond and T. Lo and F. S. Pidala
                 and G. Steinbrueck",
  title =        "Self-timed interface for {S/390 I/O} subsystem
                 interconnection",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "829--846",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/hoke.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jackson:1999:ISH,
  author =       "K. M. Jackson and K. N. Langston",
  title =        "{IBM S/390} storage hierarchy {G5} and {G6}
                 performance considerations",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "847--854",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/jackson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rao:1999:ICB,
  author =       "C. L. Rao and G. M. King and B. A. Weiler",
  title =        "{Integrated Cluster Bus} performance for the {IBM
                 S/390 Parallel Sysplex}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "855--862",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/rao.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Spainhower:1999:IPE,
  author =       "L. Spainhower and T. A. Gregg",
  title =        "{IBM S/390 Parallel Enterprise Server G5} fault
                 tolerance: a historical perspective",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "863--873",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/spainhower.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mueller:1999:RSI,
  author =       "M. Mueller and L. C. Alves and W. Fischer and M. L.
                 Fair and I. Modi",
  title =        "{RAS} strategy for {IBM S/390 G5} and {G6}",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "875--888",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/mueller.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buechner:1999:EMH,
  author =       "T. Buechner and R. Fritz and P. Guenther and M. Helms
                 and K. D. Lamb and M. Loew and T. Schlipf and M. H.
                 Walz",
  title =        "Event monitoring in highly complex hardware systems",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "889--898",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/buechner.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Song:1999:GCM,
  author =       "P. Song and F. Motika and D. R. Knebel and R. F.
                 Rizzolo and M. P. Kusko",
  title =        "{S/390 G5 CMOS} microprocessor diagnostics",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "899--914",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/song.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{VanHuben:1999:PMV,
  author =       "G. A. {Van Huben} and T. G. McNamara and T. E.
                 Gilbert",
  title =        "{PLL} modeling and verification in a cycle-simulation
                 environment",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "915--925",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/vanhuben.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "927--930",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 43",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "931--935",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/authv43.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:1999:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 43",
  journal =      j-IBM-JRD,
  volume =       "43",
  number =       "5/6",
  pages =        "937--942",
  month =        sep # "\slash " # nov,
  year =         "1999",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Apr 19 18:58:23 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/435/subjv43.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Isaac:2000:PEI,
  author =       "R. D. Isaac and J. A. Kash",
  title =        "Preface: Evolution of Information Technology
                 1957--1999",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "3--5",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:05 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lesser:2000:RAM,
  author =       "M. L. Lesser and J. W. Haanstra",
  title =        "The {Random-access Memory Accounting Machine}. {I}.
                 System organization of the {IBM 305}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "6--15",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:49 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/lesser.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Noyes:2000:RAM,
  author =       "T. Noyes and W. E. Dickinson",
  title =        "The {Random-Access Memory Accounting Machine}. {II}.
                 The magnetic-disk, random-access memory",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "16--19",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:50 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/noyes.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Amdahl:2000:AIS,
  author =       "G. M. Amdahl and G. A. Blaauw and F. P. {Brooks,
                 Jr.}",
  title =        "Architecture of the {IBM System\slash 360}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "21--36",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.441.0021",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:50 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/mathcw.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/amdahl.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  remark =       "Reprint of \cite{Amdahl:1964:AIS}.",
}

@Article{Radin:2000:M,
  author =       "George Radin",
  title =        "The 801 minicomputer",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "37--46",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:50 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/radin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cocke:2000:MGR,
  author =       "John Cocke and V. Markstein",
  title =        "The evolution of {RISC} technology at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "48--55",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:51 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/cocke.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Davis:2000:SLT,
  author =       "E. M. Davis and W. E. Harding and R. S. Schwartz and
                 J. J. Corning",
  title =        "Solid Logic Technology: Versatile, high-performance
                 microelectronics",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "56--68",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:51 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/davis.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Critchlow:2000:DCC,
  author =       "D. L. Critchlow and R. H. Dennard and S. E. Schuster",
  title =        "Design and characteristics of $n$-channel
                 insulated-gate field-effect transistors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "70--82",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:52 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/critchlow.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Keyes:2000:MEL,
  author =       "R. W. Keyes",
  title =        "Miniaturization of electronics and its limits",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "84--88",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:52 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/keyes.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ames:2000:REA,
  author =       "I. Ames and F. M. d'Heurle and R. E. Horstmann",
  title =        "Reduction of electromigration in aluminum films by
                 copper doping",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "89--91",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/ames.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Miller:2000:CCR,
  author =       "L. F. Miller",
  title =        "Controlled collapse reflow chip joining",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "93--104",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:53 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/miller.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koenig:2000:ARD,
  author =       "H. R. Koenig and L. I. Maissel",
  title =        "Application of rf discharges to sputtering",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "106--110",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/koenig.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stapper:2000:LYM,
  author =       "C. H. Stapper",
  title =        "{LSI} yield modeling and process monitoring",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "112--118",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/stapper.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ito:2000:CAR,
  author =       "H. Ito",
  title =        "Chemical amplification resists: History and
                 development within {IBM}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "119--130",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:54 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/ito.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meyerson:2000:LTS,
  author =       "B. S. Meyerson",
  title =        "Low-temperature {Si} and {Si:Ge} epitaxy by ultrahigh
                 vacuum\slash chemical vapor deposition: Process
                 fundamentals",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "132--141",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/meyerson.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buturla:2000:FEA,
  author =       "E. M. Buturla and P. E. Cottrell and B. M. Grossman
                 and K. A. Salsburg",
  title =        "Finite-element analysis of semiconductor devices: The
                 {FIELDAY} program",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "142--156",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:55 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/buturla.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Darringer:2000:LSP,
  author =       "John A. Darringer and Daniel Brand and John V. Gerbi
                 and William H. {Joyner, Jr.} and Louise Trevillyan",
  title =        "{LSS}: a system for production logic synthesis",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "157--165",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/darringer.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dietrich:2000:NST,
  author =       "W. Dietrich and W. E. Proebster and P. Wolf",
  title =        "Nanosecond switching in thin magnetic films",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "167--174",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:56 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/dietrich.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hoagland:2000:HTD,
  author =       "A. S. Hoagland",
  title =        "A high track-density servo-access system for magnetic
                 recording disk storage",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "175--185",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/hoagland.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Speriosu:2000:MTF,
  author =       "V. S. Speriosu and D. A. {Herman, Jr.} and I. L.
                 Sanders and T. Yogi",
  title =        "Magnetic thin films in recording technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "186--204",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/speriosu.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Samuel:2000:SSM,
  author =       "A. L. Samuel",
  title =        "Some studies in machine learning using the game of
                 checkers",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "206--226",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:57 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/samuel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Clementi:2000:ICA,
  author =       "Enrico Clementi",
  title =        "Ab initio computations in atoms and molecules",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "228--245",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/clementi.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coppersmith:2000:C,
  author =       "D. Coppersmith",
  title =        "Cryptography",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "246--250",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:58 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/coppersmith.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Landauer:2000:SVC,
  author =       "R. Landauer",
  title =        "Spatial variation of currents and fields due to
                 localized scatterers in metallic conduction",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "251--259",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999. See comment
                 \cite{Landauer:1996:CSV}.",
  URL =          "http://www.research.ibm.com/journal/rd/441/landaueri.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Landauer:2000:IHG,
  author =       "R. Landauer",
  title =        "Irreversibility and heat generation in the computing
                 process",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "261--269",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/landauerii.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bennett:2000:NHR,
  author =       "Charles H. Bennett",
  title =        "Notes on the history of reversible computation",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "270--277",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:11:59 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/bennett.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Binnig:2000:STM,
  author =       "G. Binnig and H. Rohrer",
  title =        "Scanning tunneling microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "279--293",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/binnig.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sorokin:2000:CIL,
  author =       "P. P. Sorokin",
  title =        "Contributions of {IBM} to laser science --- 1960 to
                 the present",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "1/2",
  pages =        "294--308",
  month =        jan # "\slash " # mar,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:00 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "Special issue: reprints on Evolution of information
                 technology 1957--1999.",
  URL =          "http://www.research.ibm.com/journal/rd/441/sorokin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Horn:2000:PDI,
  author =       "Paul M. Horn",
  title =        "Preface: Directions in Information Technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "310--310",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Thompson:2000:FMD,
  author =       "D. A. Thompson and J. S. Best",
  title =        "The future of magnetic data storage technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "311--322",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:01 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/thompson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Vettiger:2000:SMT,
  author =       "P. Vettiger and M. Despont and U. Drechsler and U.
                 D{\"u}rig and W. H{\"a}berle and M. I. Lutwyche and H.
                 E. Rothuizen and R. Stutz and R. Widmer and G. K.
                 Binnig",
  title =        "The ``Millipede'': More than thousand tips for future
                 {AFM} storage",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "323--340",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/vettiger.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Ashley:2000:HDS,
  author =       "J. Ashley and M.-P Bernal and G. W. Burr and H. Coufal
                 and H. Guenther and J. A. Hoffnagle and C. M. Jefferson
                 and B. Marcus and R. M. Macfarlane and R. M. Shelby and
                 G. T. Sincerbox",
  title =        "Holographic data storage technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "341--368",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/ashley.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Isaac:2000:FCT,
  author =       "R. D. Isaac",
  title =        "The future of {CMOS} technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "369--378",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:02 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/isaac.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Theis:2000:FIT,
  author =       "T. N. Theis",
  title =        "The future of interconnection technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "379--390",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/theis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Meyerson:2000:SGB,
  author =       "B. S. Meyerson",
  title =        "Silicon:germanium-based mixed-signal technology for
                 optimization of wired and wireless telecommunications",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "391--407",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:03 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/meyerson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Wisnieff:2000:EDI,
  author =       "R. L. Wisnieff and J. J. Ritsko",
  title =        "Electronic displays for information technology",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "409--422",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:04 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/wisnieff.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Anonymous:2000:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "423--442",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Anonymous:2000:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "3",
  pages =        "443--452",
  month =        may,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-3.html",
  URL =          "http://www.research.ibm.com/journal/rd/443/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0221",
}

@Article{Tromp:2000:PPE,
  author =       "Rudolf M. Tromp",
  title =        "Preface: Papers on Emerging Analytical Techniques",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "454--455",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Jordan-Sweet:2000:SXR,
  author =       "J. L. Jordan-Sweet",
  title =        "Synchrotron {X-ray} scattering techniques for
                 microelectronics-related materials studies",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "457--476",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:05 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/jordansweet.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Batson:2000:ARA,
  author =       "P. E. Batson",
  title =        "Atomic resolution analytical microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "477--487",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/batson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Ross:2000:GPP,
  author =       "F. M. Ross",
  title =        "Growth processes and phase transformations studied by
                 in situ transmission electron microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "489--501",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:06 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/ross.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Tromp:2000:LEE,
  author =       "Rudolf M. Tromp",
  title =        "Low-energy electron microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "503--516",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/tromp.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Ludeke:2000:HEE,
  author =       "R. Ludeke",
  title =        "Hot-electron effects and oxide degradation in {MOS}
                 structures studied with ballistic electron emission
                 microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "517--534",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/ludeke.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Stohr:2000:XRS,
  author =       "J. St{\"o}hr and S. Anders",
  title =        "{X-ray} spectro-microscopy of complex materials and
                 surfaces",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "535--551",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/stohr.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Allenspach:2000:SPS,
  author =       "R. Allenspach",
  title =        "Spin-polarized scanning electron microscopy",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "553--570",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/allenspach.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Copel:2000:MEI,
  author =       "M. Copel",
  title =        "Medium-energy ion scattering for analysis of
                 microelectronic materials",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "571--582",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/copel.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Tsang:2000:PIC,
  author =       "J. C. Tsang and J. A. Kash and D. P. Vallett",
  title =        "Picosecond imaging circuit analysis",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "583--604",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/tsang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Elmroth:2000:ARS,
  author =       "E. Elmroth and F. G. Gustavson",
  title =        "Applying recursion to serial and parallel {QR}
                 factorization leads to better performance",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "605--624",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:09 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/elmroth.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Anonymous:2000:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "625--635",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:07 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Anonymous:2000:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "4",
  pages =        "637--660",
  month =        jul,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-4.html",
  URL =          "http://www.research.ibm.com/journal/rd/444/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0222",
}

@Article{Campbell:2000:F,
  author =       "George {Campbell, Jr.}",
  title =        "Foreword",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "i--ii",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 05:52:24 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/foreword.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  xxnote =       "Check pages??",
}

@Article{Donofrio:2000:MNM,
  author =       "Nicholas M. Donofrio",
  title =        "Message from {Nicholas M. Donofrio, Senior Vice
                 President, Manufacturing and Technology, IBM
                 Corporation}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "iii--iii",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 22 15:55:55 MDT 2000",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  xxnote =       "Check pages??",
}

@Article{Garcia:2000:PRC,
  author =       "Armando Garcia",
  title =        "Preface: Research contributions by {NACME Scholars}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "667--667",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:14:08 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
}

@Article{Acoff:2000:CCL,
  author =       "V. L. Acoff and R. G. Thompson",
  title =        "Characterization of constitutional liquid film
                 migration in nickel-base alloy 718",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "668--680",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:11 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/acoff.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "985KB",
}

@Article{Alexander:2000:PIP,
  author =       "W. E. Alexander and D. S. Reeves and C. S. {Gloster,
                 Jr.}",
  title =        "Parallel image processing with the block data parallel
                 architecture",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "681--702",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:11 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/alexander.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "1,804KB",
}

@Article{Carter:2000:APP,
  author =       "P. H. {Carter II} and D. J. Pines and L. v. Rudd",
  title =        "Approximate performance of periodic hypersonic cruise
                 trajectories for global reach",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "703--714",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:12 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/carter.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "645KB",
}

@Article{Drayton:2000:MPC,
  author =       "R. F. Drayton and R. M. Henderson and L. P. B.
                 Katehi",
  title =        "Monolithic packaging concepts for high isolation in
                 circuits and antennas",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "715--723",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:12 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/drayton.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "627KB",
}

@Article{Hernandez:2000:SNP,
  author =       "E. Hern{\'a}ndez and Y. Arkun",
  title =        "Stability of nonlinear polynomial {ARMA} models and
                 their inverse",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "725--747",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/hernandez.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "3,234KB",
}

@Article{Jones:2000:FRS,
  author =       "C. T. Jones and R. Celi",
  title =        "Frequency response sensitivity functions for
                 helicopter frequency domain system identification",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "748--757",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/jones.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "865KB",
}

@Article{Bell:2000:FLM,
  author =       "P. McCauley Bell and L. Crumpton",
  title =        "A fuzzy linguistic model for the prediction of carpal
                 tunnel syndrome risks in an occupational environment",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "759--769",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:13 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/mccauley.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "2,234KB",
}

@Article{Nyberg:2000:MER,
  author =       "G. B. Nyberg and R. R. Balcarcel and B. D. Follstad
                 and G. Stephanopoulos and D. I. C. Wang",
  title =        "Metabolic effects on recombinant interferon-$\gamma$
                 glycosylation in continuous culture of {Chinese}
                 hamster ovary cells",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "770--783",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:14 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/nyberg.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
  pdfsize =      "1,046KB",
}

@Article{Anonymous:2000:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "785--789",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:14 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
}

@Article{Anonymous:2000:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "5",
  pages =        "791--796",
  month =        sep,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Feb 12 08:12:15 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd44-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/445/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0223",
}

@Article{Allen:2000:CCD,
  author =       "D. H. Allen and S. H. Dhong and H. P. Hofstee and J.
                 Leenstra and K. J. Nowka and D. L. Stasiak and D. F.
                 Wendel",
  title =        "Custom circuit design as a driver of microprocessor
                 performance",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "799--822",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/allen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Gustavson:2000:MSH,
  author =       "F. G. Gustavson and I. Jonsson",
  title =        "Minimal-storage high-performance {Cholesky}
                 factorization via blocking and recursion",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "823--850",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/gustavson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Kunkel:2000:PMC,
  author =       "S. R. Kunkel and R. J. Eickemeyer and M. H. Lipasti
                 and T. J. Mullins and B. O'Krafka and H. Rosenberg and
                 S. P. VanderWiel and P. L. Vitale and L. D. Whitley",
  title =        "A performance methodology for commercial servers",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "851--872",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/kunkel.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{OConnell:2000:PNG,
  author =       "F. P. O'Connell and S. W. White",
  title =        "{POWER3}: The next generation of {PowerPC}
                 processors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "873--884",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/oconnell.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Borkenhagen:2000:MPP,
  author =       "J. M. Borkenhagen and R. J. Eickemeyer and R. N. Kalla
                 and S. R. Kunkel",
  title =        "A multithreaded {PowerPC} processor for commercial
                 servers",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "885--898",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/borkenhagen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Webb:2000:MD,
  author =       "C. F. Webb",
  title =        "{S/390} microprocessor design",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "899--907",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/webb.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Schlig:2000:SRL,
  author =       "E. S. Schlig and J. L. Sanford",
  title =        "An {SXGA} reflective liquid crystal projection light
                 valve incorporating inversion by pixel bootstrapping",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "909--918",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/schlig.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Ismail:2000:BPH,
  author =       "I. A. Saroit Ismail",
  title =        "Bandwidth problems in high-speed networks",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "919--938",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/ismail.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Anonymous:2000:RPI,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "939--952",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Anonymous:2000:P,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "953--962",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Anonymous:2000:AIV,
  author =       "Anonymous",
  title =        "Author index for {Volume 44}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "963--966",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/authv44.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Anonymous:2000:SIV,
  author =       "Anonymous",
  title =        "Subject index for {Volume 44}",
  journal =      j-IBM-JRD,
  volume =       "44",
  number =       "6",
  pages =        "967--972",
  month =        nov,
  year =         "2000",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 24 09:44:45 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/446/subjv44.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0224",
}

@Article{Shaw:2001:OEI,
  author =       "J. M. Shaw and P. F. Seidlers",
  title =        "Organic electronics: Introduction",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "3--10",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/shaw.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Dimitrakopoulos:2001:OTF,
  author =       "C. D. Dimitrakopoulos and D. J. Mascaro",
  title =        "Organic thin-film transistors: a review of recent
                 advances",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "11--28",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/dimitrakopoulos.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Mitzi:2001:OIE,
  author =       "D. B. Mitzi and K. Chondroudis and C. R. Kagan",
  title =        "Organic-inorganic electronics",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "29--46",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/mitzi.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Murray:2001:CSN,
  author =       "C. B. Murray and Shouheng Sun and W. Gaschler and H.
                 Doyle and T. A. Betley and C. R. Kagan",
  title =        "Colloidal synthesis of nanocrystals and nanocrystal
                 superlattices",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "47--56",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/murray.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Angelopoulos:2001:CPM,
  author =       "M. Angelopoulos",
  title =        "Conducting polymers in microelectronics",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "57--76",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/angelopoulos.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Riess:2001:ITI,
  author =       "W. Riess and H. Riel and T. Beierlein and W.
                 Br{\"u}tting and P. M{\"u}ller and P. F. Seidler",
  title =        "Influence of trapped and interfacial charges in
                 organic multilayer light-emitting devices",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "77--88",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/riess.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Alvarado:2001:SEE,
  author =       "S. F. Alvarado and L. Rossi and P. M{\"u}ller and P.
                 F. Seidler and W. Riess",
  title =        "{STM}-excited electroluminescence and spectroscopy on
                 organic materials for display applications",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "89--100",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/alvarado.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Curioni:2001:CSO,
  author =       "A. Curioni and W. Andreoni",
  title =        "Computer simulations for organic light-emitting
                 diodes",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "101--114",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/curioni.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Howard:2001:MBU,
  author =       "W. E. Howard and O. F. Prache",
  title =        "Microdisplays based upon organic light-emitting
                 diodes",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "115--128",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/howard.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Anonymous:2001:RPIa,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "129--138",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Anonymous:2001:Pa,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "1",
  pages =        "139--184",
  month =        jan,
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Apr 7 16:28:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-1.html",
  URL =          "http://www.research.ibm.com/journal/rd/451/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0225",
}

@Article{Harper:2001:P,
  author =       "Richard E. Harper",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "187--190",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Hu:2001:AFP,
  author =       "E. C. Hu and P. A. Joubert and R. B. King and J. D.
                 LaVoie and J. M. Tracey",
  title =        "{Adaptive Fast Path Architecture}",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "191--206",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/hu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Brock:2001:EBC,
  author =       "B. C. Brock and G. D. Carpenter and E. Chiprout and M.
                 E. Dean and P. L. De Backer and E. N. Elnozahy and H.
                 Franke and M. E. Giampapa and D. Glasco and J. L.
                 Peterson and R. Rajamony and R. Ravindran and F. L.
                 Rawson and R. L. Rockhold and J. Rubio",
  title =        "Experience with building a commodity {Intel}-based
                 {ccNUMA} system",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "207--228",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/brock.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Nanda:2001:HTC,
  author =       "A. K. Nanda and A.-T. Nguyen and M. M. Michael and D.
                 J. Joseph",
  title =        "High-throughput coherence control and hardware
                 messaging in {Everest}",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "229--243",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/nanda.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Franaszek:2001:ADS,
  author =       "P. A. Franaszek and P. Heidelberger and D. E. Poff and
                 J. T. Robinson",
  title =        "Algorithms and data structures for compressed-memory
                 machines",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "245--258",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/franaszek.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Franaszek:2001:IOC,
  author =       "P. A. Franaszek and J. T. Robinson",
  title =        "On internal organization in compressed random-access
                 memories",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "259--270",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/robinson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Tremaine:2001:IME,
  author =       "R. B. Tremaine and P. A. Franaszek and J. T. Robinson
                 and C. O. Schulz and T. B. Smith and M. E. Wazlowski
                 and P. M. Bland",
  title =        "{IBM Memory Expansion Technology} ({MXT})",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "271--285",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/tremaine.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Abali:2001:MET,
  author =       "B. Abali and H. Franke and D. E. Poff and R. A.
                 {Saccone, Jr.} and C. O. Schulz and L. M. Herger and T.
                 B. Smith",
  title =        "{Memory Expansion Technology} ({MXT}): Software
                 support and performance",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "287--302",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Smith:2001:MET,
  author =       "T. B. Smith and B. Abali and D. E. Poff and R. B.
                 Tremaine",
  title =        "{Memory Expansion Technology} ({MXT}): Competitive
                 impact",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "303--309",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/smith.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Castelli:2001:PMS,
  author =       "V. Castelli and R. E. Harper and P. Heidelberger and
                 S. W. Hunter and K. S. Trivedi and K. Vaidyanathan and
                 W. P. Zeggert",
  title =        "Proactive management of software aging",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "311--332",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/castelli.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Anonymous:2001:RPIb,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "333--338",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/recentpub.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Anonymous:2001:Pb,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "2",
  pages =        "339--360",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jul 25 12:07:16 MDT 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-2.html",
  URL =          "http://www.research.ibm.com/journal/rd/452/patents.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0226",
}

@Article{Swope:2001:P,
  author =       "William C. Swope and James M. Coffin and Barry
                 Robsons",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "363--365",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/preface.html;
                 http://www.research.ibm.com/journal/rd/453/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Morokuma:2001:MSS,
  author =       "K. Morokuma and D. G. Musaev and T. Vreven and H.
                 Basch and M. Torrent and D. V. Khoroshun",
  title =        "Model studies of the structures, reactivities, and
                 reaction mechanisms of metalloenzymes",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "367--395",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/morokuma.html;
                 http://www.research.ibm.com/journal/rd/453/morokuma.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Andreoni:2001:DBM,
  author =       "W. Andreoni and A. Curioni and T. Mordasini",
  title =        "{DFT}-based molecular dynamics as a new tool for
                 computational biology: {First} applications and
                 perspective",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "397--407",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/andreoni.html;
                 http://www.research.ibm.com/journal/rd/453/andreoni.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Huang:2001:QCD,
  author =       "L. Huang and L. Massa and J. Karle",
  title =        "Quantum crystallography, a developing area of
                 computational chemistry extending to macromolecules",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "409--416",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/huang.html;
                 http://www.research.ibm.com/journal/rd/453/huang.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Ayton:2001:IMD,
  author =       "G. S. D. Ayton and S. Bardenhagen and P. McMurtry and
                 D. Sulsky and G. A. Voth",
  title =        "Interfacing molecular dynamics with continuum dynamics
                 in computer simulation: {Toward} an application to
                 biological membranes",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "417--426",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/ayton.html;
                 http://www.research.ibm.com/journal/rd/453/ayton.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Baker:2001:AMF,
  author =       "N. A. Baker and D. Sept and M. J. Holst and J. A.
                 McCammon",
  title =        "The adaptive multilevel finite element solution of the
                 {Poisson--Boltzmann} equation on massively parallel
                 computers",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "427--438",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/baker.html;
                 http://www.research.ibm.com/journal/rd/453/baker.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Davison:2001:BFE,
  author =       "D. B. Davison and J. F. Burke",
  title =        "Brute force estimation of the number of human genes
                 using {EST} clustering as a measure",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "439--447",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/davison.html;
                 http://www.research.ibm.com/journal/rd/453/davison.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Birney:2001:HMM,
  author =       "E. Birney",
  title =        "Hidden {Markov} models in biological sequence
                 analysis",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "449--454",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/birney.html;
                 http://www.research.ibm.com/journal/rd/453/birney.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Floratos:2001:DPB,
  author =       "A. Floratos and I. Rigoutsos and L. Parida and Y.
                 Gao",
  title =        "{DELPHI}: a pattern-based method for detecting
                 sequence similarity",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "455--473",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/floratos.html;
                 http://www.research.ibm.com/journal/rd/453/floratos.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Eastwood:2001:EPS,
  author =       "M. P. Eastwood and C. Hardin and Z. Luthey-Schulten
                 and P. G. Wolynes",
  title =        "Evaluating protein structure-prediction schemes using
                 energy landscape theory",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "475--497",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/eastwood.html;
                 http://www.research.ibm.com/journal/rd/453/eastwood.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Kumar:2001:PFE,
  author =       "S. Kumar and H. J. Wolfson and R. Nussinov",
  title =        "Protein flexibility and electrostatic interactions",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "499--512",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/kumar.html;
                 http://www.research.ibm.com/journal/rd/453/kumar.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Tsai:2001:HBB,
  author =       "C.-J. Tsai and B. Ma and Y. Y. Sham and S. Kumar and
                 H. J. Wolfson and R. Nussinov",
  title =        "A hierarchical, building-block-based computational
                 scheme for protein structure prediction",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "513--523",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/tsai.html;
                 http://www.research.ibm.com/journal/rd/453/tsai.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Fain:2001:DOC,
  author =       "B. Fain and Y. Xia and M. Levitt",
  title =        "Determination of optimal {Chebyshev}-expanded
                 hydrophobic discrimination function for globular
                 proteins",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "525--532",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/fain.html;
                 http://www.research.ibm.com/journal/rd/453/fain.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Platt:2001:QGU,
  author =       "D. E. Platt and L. Parida and Y. Gao and A. Floratos
                 and I. Rigoutsos",
  title =        "{QSAR} in grossly underdetermined systems:
                 {Opportunities} and issues",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "533--544",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/platt.html;
                 http://www.research.ibm.com/journal/rd/453/platt.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Agrafiotis:2001:MOC,
  author =       "D. K. Agrafiotis",
  title =        "Multiobjective optimization of combinatorial
                 libraries",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "545--566",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/agrafiotis.html;
                 http://www.research.ibm.com/journal/rd/453/agrafiotis.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Anonymous:2001:RPIe,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "567--573",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/recentpub.html;
                 http://www.research.ibm.com/journal/rd/453/recentpub.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Anonymous:2001:Pe,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "3/4",
  pages =        "575--600",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:12 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-34.html",
  URL =          "http://www.research.ibm.com/journal/rd/453/patents.html;
                 http://www.research.ibm.com/journal/rd/453/patents.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0227",
}

@Article{Hefferon:2001:P,
  author =       "George J. Hefferon",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "603--604",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/preface.html;
                 http://www.research.ibm.com/journal/rd/455/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Bates:2001:RTN,
  author =       "A. K. Bates and M. Rothschild and T. M. Bloomstein and
                 T. H. Fedynyshyn and R. R. Kunz and V. Liberman and M.
                 Switkes",
  title =        "Review of technology for 157-nm lithography",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "605--614",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/bates.html;
                 http://www.research.ibm.com/journal/rd/455/bates.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Dhaliwal:2001:PEP,
  author =       "R. S. Dhaliwal and W. A. Enichen and S. D. Golladay
                 and M. S. Gordon and R. A. Kendall and J. E. Lieberman
                 and H. C. Pfeiffer and D. J. Pinckney and C. F.
                 Robinson and J. D. Rockrohr and W. Stickel and E. V.
                 Tressler",
  title =        "{PREVAIL} --- Electron projection technology approach
                 for next-generation lithography",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "615--638",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/dhaliwal.html;
                 http://www.research.ibm.com/journal/rd/455/dhaliwal.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Medeiros:2001:RPE,
  author =       "D. R. Medeiros and A. Aviram and C. R. Guarnieri and
                 W.-S. Huang and R. Kwong and C. K. Magg and A. P.
                 Mahorowala and W. M. Moreau and K. E. Petrillo and M.
                 Angelopoulos",
  title =        "Recent progress in electron-beam resists for advanced
                 mask-making",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "639--650",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/medeiros.html;
                 http://www.research.ibm.com/journal/rd/455/medeiros.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Liebmann:2001:TDL,
  author =       "L. W. Liebmann and S. M. Mansfield and A. K. Wong and
                 M. A. Lavin and W. C. Leipold and T. G. Dunham",
  title =        "{TCAD} development for lithography resolution
                 enhancement",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "651--665",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/liebmann.html;
                 http://www.research.ibm.com/journal/rd/455/liebmann.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Hinsberg:2001:CPA,
  author =       "W. D. Hinsberg and F. A. Houle and M. I. Sanchez and
                 G. M. Wallraff",
  title =        "Chemical and physical aspects of the post-exposure
                 baking process used for positive-tone chemically
                 amplified resists",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "667--682",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/hinsberg.html;
                 http://www.research.ibm.com/journal/rd/455/hinsberg.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Ito:2001:DBC,
  author =       "H. Ito",
  title =        "Dissolution behavior of chemically amplified resist
                 polymers for 248-, 193-, and 157-nm lithography",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "683--695",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/ito.html;
                 http://www.research.ibm.com/journal/rd/455/ito.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Michel:2001:PML,
  author =       "B. Michel and A. Bernard and A. Bietsch and E.
                 Delamarche and M. Geissler and D. Juncker and H. Kind
                 and J.-P. Renault and H. Rothuizen and H. Schmid and P.
                 Schmidt-Winkel and R. Stutz and H. Wolf",
  title =        "Printing meets lithography: {Soft} approaches to
                 high-resolution patterning",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "697--719",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/michel.html;
                 http://www.research.ibm.com/journal/rd/455/michel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Anonymous:2001:RPIc,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "721--730",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/recentpub.html;
                 http://www.research.ibm.com/journal/rd/455/recentpub.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Anonymous:2001:Pc,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "5",
  pages =        "731--760",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-5.html",
  URL =          "http://www.research.ibm.com/journal/rd/455/patents.html;
                 http://www.research.ibm.com/journal/rd/455/patents.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0228",
}

@Article{Steele:2001:UBB,
  author =       "S. W. Steele",
  title =        "Uninterruptible battery backup for {IBM AS\slash 400}
                 systems",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "763--770",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  URL =          "http://www.research.ibm.com/journal/rd/456/steele.html;
                 http://www.research.ibm.com/journal/rd/456/steele.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Notohardjono:2001:MSF,
  author =       "B. D. Notohardjono and J. S. Corbin and S. J. Mazzuca
                 and S. C. McIntosh and H. Welz",
  title =        "Modular server frame with robust earthquake
                 retention",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "771--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Kuczynski:2001:SMN,
  author =       "J. Kuczynski and A. K. Sinha",
  title =        "Strain measurement and numerical analysis of an epoxy
                 adhesive subjected to thermal loads",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "783--788",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  URL =          "http://www.research.ibm.com/journal/rd/456/kuczynski.html;
                 http://www.research.ibm.com/journal/rd/456/kuczynski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Irvin:2001:ESC,
  author =       "D. R. Irvin",
  title =        "Embedding a secondary communication channel
                 transparently within a cyclic redundancy check
                 ({CRC})",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "789--796",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  URL =          "http://www.research.ibm.com/journal/rd/456/irvin.html;
                 http://www.research.ibm.com/journal/rd/456/irvin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Alfonseca:2001:DFD,
  author =       "M. Alfonseca and A. Ortega",
  title =        "Determination of fractal dimensions from equivalent
                 {$L$} systems",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "797--805",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  URL =          "http://www.research.ibm.com/journal/rd/456/alfonseca.html;
                 http://www.research.ibm.com/journal/rd/456/alfonseca.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Zuliani:2001:LR,
  author =       "P. Zuliani",
  title =        "Logical reversibility",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "807--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Matick:2001:AAF,
  author =       "R. E. Matick and T. J. Heller and M. Ignatowski",
  title =        "Analytical analysis of finite cache penalty and cycles
                 per instruction of a multiprocessor memory hierarchy
                 using miss rates and queuing theory",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "819--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:RPId,
  author =       "Anonymous",
  title =        "Recent publications by {IBM} authors",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "843--849 (??)",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:Pd,
  author =       "Anonymous",
  title =        "Patents",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "849--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:AIV,
  author =       "Anonymous",
  title =        "Author index for {Volume 45}",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "857--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:SIV,
  author =       "Anonymous",
  title =        "Subject index for {Volume 45}",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "863--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:EEN,
  author =       "Anonymous",
  title =        "Erratum and {Editor}'s Note",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "870--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:PPP,
  author =       "Anonymous",
  title =        "Papers on power and packaging in {IBM} systems",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Anonymous:2001:RP,
  author =       "Anonymous",
  title =        "Regular papers",
  journal =      j-IBM-JRD,
  volume =       "45",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2001",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 14 18:58:13 MST 2001",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/rd45-6.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0229",
}

@Article{Lund:2002:P,
  author =       "Vijay T. Lund",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "3--4",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/preface.html;
                 http://www.research.ibm.com/journal/rd/461/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Tendler:2002:PSM,
  author =       "J. M. Tendler and J. S. Dodson and J. S. {Fields, Jr.}
                 and H. Le and B. Sinharoy",
  title =        "{POWER4} system microarchitecture",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "5--25",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/tendler.html;
                 http://www.research.ibm.com/journal/rd/461/tendler.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Warnock:2002:CPD,
  author =       "J. D. Warnock and J. M. Keaty and J. Petrovick and J.
                 G. Clabes and C. J. Kircher and B. L. Krauter and P. J.
                 Restle and B. A. Zoric and C. J. Anderson",
  title =        "The circuit and physical design of the {POWER4}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "27--51",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/warnock.html;
                 http://www.research.ibm.com/journal/rd/461/warnock.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Ludden:2002:FVP,
  author =       "J. M. Ludden and W. Roesner and G. M. Heiling and J.
                 R. Reysa and J. R. Jackson and B.-L. Chu and M. L. Behm
                 and J. R. Baumgartner and R. D. Peterson and J.
                 Abdulhafiz and W. E. Bucy and J. H. Klaus and D. J.
                 Klema and T. N. Le and F. D. Lewis and P. E. Milling
                 and L. A. McConville and B. S. Nelson and V. Paruthi
                 and T. W. Pouarz and A. D. Romonosky and J. Stuecheli
                 and K. D. Thompson and D. W. Victor and B. Wile",
  title =        "Functional verification of the {POWER4} microprocessor
                 and {POWER4} multiprocessor systems",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "53--76",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/ludden.html;
                 http://www.research.ibm.com/journal/rd/461/ludden.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Bossen:2002:FTD,
  author =       "D. C. Bossen and A. Kitamorn and K. F. Reick and M. S.
                 Floyd",
  title =        "Fault-tolerant design of the {IBM pSeries 690} system
                 using {POWER4} processor technology",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "77--86",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/bossen.html;
                 http://www.research.ibm.com/journal/rd/461/bossen.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Rodgers:2002:IRL,
  author =       "G. P. Rodgers and I. G. Bendrihem and T. J. Bucelot
                 and B. D. Burchett and J. C. Collins",
  title =        "Infrastructure requirements for a large-scale,
                 multi-site {VLSI} development project",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "87--95",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/rodgers.html;
                 http://www.research.ibm.com/journal/rd/461/rodgers.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Agarwal:2002:FPN,
  author =       "R. C. Agarwal and R. F. Enenkel and F. G. Gustavson
                 and A. Kothari and M. Zubair",
  title =        "Fast pseudorandom-number generators with modulus $2^k$
                 or $2^{k-1}$ using fused multiply--add",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "1",
  pages =        "97--116",
  month =        jan,
  year =         "2002",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.461.0097",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Mar 18 17:27:08 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/461/agarwal.html;
                 http://www.research.ibm.com/journal/rd/461/agarwal.pdf",
  abstract =     "Many numerically intensive computations done in a
                 scientific computing environment require uniformly
                 distributed pseudorandom numbers in the range $(0, 1)$
                 and $(-1, 1)$. For multiplicative congruential
                 generators with modulus $2^k$, $k \leq 52$, and period
                 $2^k-2$, we show that the cost per random number for
                 these two distributions is 3 and 3.125 multiply-adds on
                 RS/6000 processors. Our code, on the IBM POWER2 Model
                 590, produces more than 40 million uniformly
                 distributed pseudorandom numbers per second for both
                 ranges $(0, 1)$ and $(-1, 1)$. Additionally, our code
                 sustains the 40 million per second rate for data out of
                 cache. The Numerical Aerodynamic Simulation (NAS)
                 parallel benchmarks use a linear congruential generator
                 with modulus 246. Our result is about 50 times faster
                 than the generic implementation given in the
                 benchmarks. The extra-accuracy fused multiply-add
                 instruction of RS/6000 machines combined with a few
                 algorithmic innovations gives rise to the 50-fold
                 increase. If IEEE 64-bit arithmetic is used with our
                 Fortran code on POWER and PowerPC architectures, the
                 results we obtain are bit-wise identical to the generic
                 algorithms. The paper gives several illustrations of a
                 general technique called the Algorithm and Architecture
                 approach. We demonstrate herein that
                 programmer-controlled unrolling of loops is equivalent
                 to ``customized vectorization of RISC-type code.''
                 Customized vectorization is more powerful than ordinary
                 vectorization, and it is only possible on RISC-type
                 machines. We illustrate its use to show that RS/6000
                 processors can compute the distribution $(-1, 1)$ at
                 the rate of 3.125 multiply-adds. We also specify a
                 linear congruential generator that is related to the
                 multiplicative congruential generator referred to
                 above. It has a full period of 2k, where 2k is the
                 modulus. The cost per random number [in the range $(0,
                 1)$] for this generator is four multiply-adds on
                 RS/6000 processors. Our code, on the IBM POWER2 Model
                 590, for this generator produces more than 30 million
                 uniformly distributed pseudorandom numbers per second
                 for the range $(0, 1)$. We show that this generator is
                 ``embarrassingly parallel,'' or EP. Using the Algorithm
                 and Architecture approach, we describe a new concept
                 called ``generalized unrolling.'' Finally, we present a
                 multiplicative congruential generator for which the
                 modulus is not a power of $2$. Such a generator, as
                 well as one with modulus $2^k$, is selectable as the
                 generator used in the RANDOM\_NUMBER intrinsic function
                 of IBM XL Fortran and XL High Performance Fortran. All
                 of the generators reported here are EP. Using an IBM
                 SP2 machine with 250 wide nodes, it is possible to
                 compute more than ten billion uniform random numbers in
                 a second.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0230",
}

@Article{Solomon:2002:P,
  author =       "Paul M. Solomon",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "119--120",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Shahidi:2002:STG,
  author =       "G. G. Shahidi",
  title =        "{SOI} technology for the {GHz} era",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "121--132",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/shahidi.html;
                 http://www.research.ibm.com/journal/rd/462/shahidi.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Wong:2002:BCT,
  author =       "H.-S. P. Wong",
  title =        "Beyond the conventional transistor",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "133--168",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/wong.html;
                 http://www.research.ibm.com/journal/rd/462/wong.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Nowak:2002:MBC,
  author =       "E. J. Nowak",
  title =        "Maintaining the benefits of {CMOS} scaling when
                 scaling bogs down",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "169--180",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/nowak.html;
                 http://www.research.ibm.com/journal/rd/462/nowak.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Ning:2002:WBS,
  author =       "T. H. Ning",
  title =        "Why {BiCMOS} and {SOI BiCMOS}?",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "181--186",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/ning.html;
                 http://www.research.ibm.com/journal/rd/462/ning.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Mandelman:2002:CFD,
  author =       "J. A. Mandelman and R. H. Dennard and G. B. Bronner
                 and J. K. DeBrosse and R. Divakaruni and Y. Li and C.
                 J. Radens",
  title =        "Challenges and future directions for the scaling of
                 dynamic random-access memory ({DRAM})",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "187--212",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/mandelman.html;
                 http://www.research.ibm.com/journal/rd/462/mandelman.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Taur:2002:CDN,
  author =       "Y. Taur",
  title =        "{CMOS} design near the limit of scaling",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "213--222",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/taur.html;
                 http://www.research.ibm.com/journal/rd/462/taur.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Nair:2002:EIC,
  author =       "R. Nair",
  title =        "Effect of increasing chip density on the evolution of
                 computer architectures",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "223--234",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/nair.html;
                 http://www.research.ibm.com/journal/rd/462/nair.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Frank:2002:PCC,
  author =       "D. J. Frank",
  title =        "Power-constrained {CMOS} scaling limits",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "235--244",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/frank.html;
                 http://www.research.ibm.com/journal/rd/462/frank.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Meindl:2002:IOG,
  author =       "J. D. Meindl and J. A. Davis and P. Zarkesh-Ha and C.
                 S. Patel and K. P. Martin and P. A. Kohl",
  title =        "Interconnect opportunities for gigascale integration",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "245--263",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/meindl.html;
                 http://www.research.ibm.com/journal/rd/462/meindl.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Stathis:2002:RLG,
  author =       "J. H. Stathis",
  title =        "Reliability limits for the gate insulator in {CMOS}
                 technology",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "265--286",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/stathis.html;
                 http://www.research.ibm.com/journal/rd/462/stathis.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Wu:2002:CSB,
  author =       "E. Y. Wu and E. J. Nowak and A. Vayshenker and W. L.
                 Lai and D. L. Harmon",
  title =        "{CMOS} scaling beyond the 100-nm node with
                 silicon-dioxide-based gate dielectrics",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "287--298",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/wu.html;
                 http://www.research.ibm.com/journal/rd/462/wu.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Osburn:2002:VSM,
  author =       "C. M. Osburn and I. Kim and S. K. Han and I. De and K.
                 F. Yee and S. Gannavaram and S. J. Lee and C.-H. Lee
                 and Z. J. Luo and W. Zhu and J. R. Hauser and D.-L.
                 Kwong and G. Lucovsky and T. P. Ma and M. C.
                 {\"O}zt{\"u}rk",
  title =        "Vertically scaled {MOSFET} gate stacks and junctions:
                 How far are we likely to go?",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "299--315",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/osburn.html;
                 http://www.research.ibm.com/journal/rd/462/osburn.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Agnello:2002:PRC,
  author =       "P. D. Agnello",
  title =        "Process requirements for continued scaling of
                 {CMOS}---the need and prospects for atomic-level
                 manipulation",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "317--338",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/agnello.html;
                 http://www.research.ibm.com/journal/rd/462/agnello.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Law:2002:PMF,
  author =       "M. E. Law",
  title =        "Process modeling for future technologies",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "339--346",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/law.html;
                 http://www.research.ibm.com/journal/rd/462/law.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Lochtefeld:2002:NIC,
  author =       "A. Lochtefeld and I. J. Djomehri and G. Samudra and D.
                 A. Antoniadis",
  title =        "New insights into carrier transport in {n-MOSFETs}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "2/3",
  pages =        "347--357",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/462/lochtefeld.html;
                 http://www.research.ibm.com/journal/rd/462/lochtefeld.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0231",
}

@Article{Turgeon:2002:P,
  author =       "Paul R. Turgeon",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "365--366",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/preface.html;
                 http://www.research.ibm.com/journal/rd/464/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Plambeck:2002:DAZ,
  author =       "K. E. Plambeck and W. Eckert and R. R. Rogers and C.
                 F. Webb",
  title =        "Development and attributes of {z/Architecture}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "367--379",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/plambeck.html;
                 http://www.research.ibm.com/journal/rd/464/plambeck.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Schwarz:2002:MIE,
  author =       "E. M. Schwarz and M. A. Check and C.-L. K. Shum and T.
                 Koehler and S. B. Swaney and J. D. MacDougall and C. A.
                 Krygowski",
  title =        "The microarchitecture of the {IBM eServer z900}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "381--395",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/schwarz.html;
                 http://www.research.ibm.com/journal/rd/464/schwarz.pdf",
  abstract =     "The recent IBM ESA/390 CMOS line of processors, from
                 1997 to 1999, consisted of the G4, G5, and G6
                 processors. The architecture they implemented lacked
                 64-bit addressability and had only a limited set of
                 64-bit arithmetic instructions. The processors also
                 lacked data and instruction bandwidth, since they
                 utilized a unified cache. The branch performance was
                 good, but there were delays due to conflicts in
                 searching and writing the branch target buffer. Also,
                 the hardware data compression and decimal arithmetic
                 performance, though good, was in demand by database and
                 COBOL programmers. Most of the performance concerns
                 regarding prior processors were due to area
                 constraints. Recent technology advances have increased
                 the circuit density by 50 percent over that of the G6
                 processor. This has allowed the design of several
                 performance-critical areas to be revisited. The end
                 result of these efforts is the IBM eServer z900
                 processor, which is the first high-end processor based
                 on the new 64-bit z/Architecture{\TM}.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Harrer:2002:FSL,
  author =       "H. Harrer and H. Pross and T.-M. Winkel and W. D.
                 Becker and H. I. Stoller and M. Yamamoto and S. Abe and
                 B. J. Chamberlin and G. A. Katopis",
  title =        "First- and second-level packaging for the {IBM eServer
                 z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "397--420",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/harrer.html;
                 http://www.research.ibm.com/journal/rd/464/harrer.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Stigliani:2002:IEZ,
  author =       "D. J. {Stigliani, Jr.} and T. E. Bubb and D. F. Casper
                 and J. H. Chin and S. G. Glassen and J. M. Hoke and V.
                 A. Minassian and J. H. Quick and C. H. Whitehead",
  title =        "{IBM eServer z900} {I/O} subsystem",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "421--445",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/stigliani.html;
                 http://www.research.ibm.com/journal/rd/464/stigliani.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Hoke:2002:STI,
  author =       "J. M. Hoke and P. W. Bond and R. R. Livolsi and T. C.
                 Lo and F. S. Pidala and G. Steinbrueck",
  title =        "Self-timed interface of the input\slash output
                 subsystem of the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "447--460",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/hoke.html;
                 http://www.research.ibm.com/journal/rd/464/hoke.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Gregg:2002:CCI,
  author =       "T. A. Gregg and R. K. Errickson",
  title =        "Coupling {I/O} channels for the {IBM eServer z900}:
                 Reengineering required",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "461--474",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/gregg.html;
                 http://www.research.ibm.com/journal/rd/464/gregg.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Baskey:2002:ZFO,
  author =       "M. E. Baskey and M. Eder and D. A. Elko and B. H.
                 Ratcliff and D. W. Schmidt",
  title =        "{zSeries} features for optimized sockets-based
                 messaging: {HiperSockets} and {OSA-Express}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "475--485",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/baskey.html;
                 http://www.research.ibm.com/journal/rd/464/baskey.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Adlung:2002:FIE,
  author =       "I. Adlung and G. Banzhaf and W. Eckert and G. Kuch and
                 S. Mueller and C. Raisch",
  title =        "{FCP} for the {IBM eServer zSeries} systems: Access to
                 distributed storage",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "487--502",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/adlung.html;
                 http://www.research.ibm.com/journal/rd/464/adlung.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Alves:2002:RDI,
  author =       "L. C. Alves and M. L. Fair and P. J. Meaney and C. L.
                 Chen and W. J. Clarke and G. C. Wellwood and N. E.
                 Weber and I. N. Modi and B. K. Tolan and F. Freier",
  title =        "{RAS} design for the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "503--521",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/alves.html;
                 http://www.research.ibm.com/journal/rd/464/alves.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Baitinger:2002:SCS,
  author =       "F. Baitinger and H. Elfering and G. Kreissig and D.
                 Metz and J. Saalmueller and F. Scholz",
  title =        "System control structure of the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "523--535",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/baitinger.html;
                 http://www.research.ibm.com/journal/rd/464/baitinger.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Bieswanger:2002:HCF,
  author =       "A. Bieswanger and F. Hardt and A. Kreissig and H.
                 Osterndorf and G. Stark and H. Weber",
  title =        "Hardware configuration framework for the {IBM eServer
                 z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "537--550",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/bieswanger.html;
                 http://www.research.ibm.com/journal/rd/464/bieswanger.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Probst:2002:FCC,
  author =       "J. Probst and B. D. Valentine and C. Axnix and K.
                 Kuehl",
  title =        "Flexible configuration and concurrent upgrade for the
                 {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "551--558",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/probst.html;
                 http://www.research.ibm.com/journal/rd/464/probst.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Valentine:2002:ASE,
  author =       "B. D. Valentine and H. Weber and J. D. Eggleston",
  title =        "The alternate support element, a high-availability
                 service console for the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "559--566",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/valentine.html;
                 http://www.research.ibm.com/journal/rd/464/valentine.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Rooney:2002:IRD,
  author =       "W. J. Rooney and J. P. Kubala and J. Maergner and P.
                 B. Yocom",
  title =        "{Intelligent Resource Director}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "567--586",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/rooney.html;
                 http://www.research.ibm.com/journal/rd/464/rooney.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Koerner:2002:IEZ,
  author =       "S. Koerner and M. Kuenzel and E. C. McCain",
  title =        "{IBM eServer z900} system microcode verification by
                 simulation: The virtual power-on process",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "587--596",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/koerner.html;
                 http://www.research.ibm.com/journal/rd/464/koerner.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Kayser:2002:HAH,
  author =       "J. Kayser and S. Koerner and K.-D. Schubert",
  title =        "Hyper-acceleration and {HW\slash SW} co-verification
                 as an essential part of {IBM eServer z900}
                 verification",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "597--605",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/kayser.html;
                 http://www.research.ibm.com/journal/rd/464/kayser.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Buttlar:2002:ZCE,
  author =       "J. von Buttlar and H. B{\"o}hm and R. Ernst and A.
                 Horsch and A. Kohler and H. Schein and M. Stetter and
                 K. Theurich",
  title =        "{z/CECSIM}: An efficient and comprehensive microcode
                 simulator for the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "607--615",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/vonbuttlar.html;
                 http://www.research.ibm.com/journal/rd/464/vonbuttlar.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Silverio:2002:HID,
  author =       "J. F. Silverio and Y. M. Ng and D. F. Anderson",
  title =        "Hierarchical indexing data structure method for
                 verifying the functionality of the {STI-to-PCI} bridge
                 chips of the {IBM eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "617--629",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/silverio.html;
                 http://www.research.ibm.com/journal/rd/464/silverio.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Curran:2002:IEZ,
  author =       "B. W. Curran and Y. H. Chan and P. T. Wu and P. J.
                 Camporese and G. A. Northrop and R. F. Hatch and L. B.
                 Lacey and J. P. Eckhardt and D. T. Hui and H. H.
                 Smith",
  title =        "{IBM eServer z900} high-frequency microprocessor
                 technology, circuits, and design methodology",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "631--644",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/curran.html;
                 http://www.research.ibm.com/journal/rd/464/curran.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Desens:2002:MVP,
  author =       "Michael Desens",
  title =        "Message from the {Vice President, Server Systems
                 Development, IBM Server Group}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "4/5",
  pages =        "??--??",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:43 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/464/message.html;
                 http://www.research.ibm.com/journal/rd/464/message.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0232",
}

@Article{Reeves:2002:P,
  author =       "Thomas M. Reeves and Timothy K. Raveys",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "647--647",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Doerre:2002:IAS,
  author =       "G. W. Doerre and D. E. Lackey",
  title =        "The {IBM ASIC\slash SoC} methodology---{A} recipe for
                 first-time success",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "649--660",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/doerre.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Bednar:2002:ISP,
  author =       "T. R. Bednar and P. H. Buffet and R. J. Darden and S.
                 W. Gould and P. S. Zuchowski",
  title =        "Issues and strategies for the physical design of
                 system-on-a-chip {ASICs}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "661--674",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/bednar.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Barth:2002:EDD,
  author =       "J. E. {Barth, Jr.} and J. H. Dreibelbis and E. A.
                 Nelson and D. L. Anand and G. Pomichter and P. Jakobsen
                 and M. R. Nelms and J. Leach and G. M. Belansek",
  title =        "Embedded {DRAM} design and architecture for the {IBM}
                 $0.11\mu$m {ASIC} offering",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "675--689",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/barth.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Darringer:2002:EAT,
  author =       "J. A. Darringer and R. A. Bergamaschi and S.
                 Bhattacharya and D. Brand and A. Herkersdorf and J. K.
                 Morrell and I. I. Nair and P. Sagmeister and Y. Shin",
  title =        "Early analysis tools for system-on-a-chip design",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "691--707",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/darringer.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Cozzolino:2002:P,
  author =       "Vincent Cozzolino and Prabjit Singhs",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "709--709",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/preface2.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Singh:2002:PPC,
  author =       "P. Singh and S. J. Ahladas and W. D. Becker and F. E.
                 Bosco and J. P. Corrado and G. F. Goth and S. Iruvanti
                 and M. A. Nobile and B. D. Notohardjono and J. H. Quick
                 and E. J. Seminaro and K. M. Soohoo and C. Wu",
  title =        "A power, packaging, and cooling overview of the {IBM
                 eServer z900}",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "711--738",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/singh.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Schmidt:2002:HES,
  author =       "R. R. Schmidt and B. D. Notohardjono",
  title =        "High-end server low-temperature cooling",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "739--751",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/schmidt.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Ellsworth:2002:DAS,
  author =       "M. J. {Ellsworth, Jr.} and R. R. Schmidt and D.
                 Agonafer",
  title =        "Design and analysis of a scheme to mitigate
                 condensation on an assembly used to cool a processor
                 module",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "753--761",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/ellsworth.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Corbin:2002:LGA,
  author =       "J. S. Corbin and C. N. Ramirez and D. E. Massey",
  title =        "Land grid array sockets for server applications",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "763--778",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/corbin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Knickerbocker:2002:AMM,
  author =       "J. U. Knickerbocker and F. L. Pompeo and A. F. Tai and
                 D. L. Thomas and R. D. Weekly and M. G. Nealon and H.
                 C. Hamel and A. Haridass and J. N. Humenik and R. A.
                 Shelleman and S. N. Reddy and K. M. Prettyman and B. V.
                 Fasano and S. K. Ray and T. E. Lombardi and K. C.
                 Marston and P. A. Coico and P. J. Brofman and L. S.
                 Goldmann and D. L. Edwards and J. A. Zitz and S.
                 Iruvanti and S. L. Shinde and H. P. Longworth",
  title =        "An advanced multichip module ({MCM}) for
                 high-performance {UNIX} servers",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "779--804",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/knickerbocker.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Anonymous:2002:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 46",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "805--810",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/authv46.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Anonymous:2002:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 46",
  journal =      j-IBM-JRD,
  volume =       "46",
  number =       "6",
  pages =        "811--816",
  month =        "????",
  year =         "2002",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Nov 22 17:58:44 MST 2002",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/466/subjv46.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0233",
}

@Article{Dietrich:2003:P,
  author =       "Brenda Dietrich and Michael Shubs",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "3--3",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Adler:2003:MH,
  author =       "R. L. Adler and B. P. Kitchens and M. Martens and C.
                 P. Tresser and C. W. Wu",
  title =        "The mathematics of halftoning",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "5--15",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/adler.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Apte:2003:DIA,
  author =       "C. V. Apte and S. J. Hong and R. Natarajan and E. P.
                 D. Pednault and F. A. Tipu and S. M. Weiss",
  title =        "Data-intensive analytics for predictive modeling",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "17--23",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/apte.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Dietrich:2003:GAP,
  author =       "B. L. Dietrich and A. J. Hoffman",
  title =        "On greedy algorithms, partially ordered sets, and
                 submodular functions",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "25--30",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/dietrich.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Gustavson:2003:HPL,
  author =       "F. G. Gustavson",
  title =        "High-performance linear algebra algorithms using new
                 generalized data structures for matrices",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "31--55",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/gustavson.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Lougee-Heimer:2003:COI,
  author =       "R. Lougee-Heimer",
  title =        "The {Common Optimization INterface for Operations
                 Research}: Promoting open-source software in the
                 operations research community",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "57--66",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.coin-or.org/;
                 http://www.research.ibm.com/journal/rd/471/lougee.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Martens:2003:ETO,
  author =       "M. Martens and T. J. Nowicki",
  title =        "Ergodic theory of one-dimensional dynamics",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "67--76",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/martens.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Wisniewski:2003:EEC,
  author =       "M. Y. L. Wisniewski and E. Yashchin and R. L. Franch
                 and D. P. Conrady and G. Fiorenza and I. C. Noyan",
  title =        "Estimating the efficiency of collaborative
                 problem-solving, with applications to chip design",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "77--88",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/wisniewski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Pulleyblank:2003:MSN,
  author =       "W. R. Pulleyblank",
  title =        "Mathematical sciences in the nineties",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "1",
  pages =        "89--96",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/471/pulleyblank.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0234",
}

@Article{Oprysko:2003:P,
  author =       "M. M. Oprysko",
  title =        "Preface: Mathematical Sciences at 40",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "99--100",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Dunn:2003:FRC,
  author =       "J. S. Dunn and D. C. Ahlgren and D. D. Coolbaugh and
                 N. B. Feilchenfeld and G. Freeman and D. R. Greenberg
                 and R. A. Groves and F. J. Guar{\'\i}n and Y. Hammad
                 and A. J. Joseph and L. D. Lanzerotti and S. A. St.Onge
                 and B. A. Orner and J.-S. Rieh and K. J. Stein and S.
                 H. Voldman and P.-C. Wang and M. J. Zierak and S.
                 Subbanna and D. L. Harame and D. A. {Herman, Jr.} and
                 B. S. Meyerson",
  title =        "Foundation of rf {CMOS} and {SiGe BiCMOS}
                 technologies",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "101--138",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/dunn.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Harame:2003:DAM,
  author =       "D. L. Harame and K. M. Newton and R. Singh and S. L.
                 Sweeney and S. E. Strang and J. B. Johnson and S. M.
                 Parker and C. E. Dickey and M. Erturk and G. J.
                 Schulberg and D. L. Jordan and D. C. Sheridan and M. P.
                 Keene and J. Boquet and R. A. Groves and M. Kumar and
                 D. A. {Herman, Jr.} and B. S. Meyerson",
  title =        "Design automation methodology and rf\slash analog
                 modeling for rf {CMOS} and {SiGe BiCMOS} technologies",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "139--175",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/harame.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Allen:2003:IPN,
  author =       "J. R. {Allen, Jr.} and B. M. Bass and C. Basso and R.
                 H. Boivie and J. L. Calvignac and G. T. Davis and L.
                 Frelechoux and M. Heddes and A. Herkersdorf and A. Kind
                 and J. F. Logan and M. Peyravian and M. A. Rinaldi and
                 R. K. Sabhikhi and M. S. Siegel and M. Waldvogel",
  title =        "{IBM PowerNP} network processor: Hardware, software,
                 and applications",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "177--193",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/allen.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Engbersen:2003:PST,
  author =       "A. P. J. Engbersen",
  title =        "{Prizma} switch technology",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "195--209",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/engbersen.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Clauberg:2003:DAA,
  author =       "R. Clauberg",
  title =        "Data aggregation architectures for single-chip
                 {SDH\slash SONET} framers",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "211--221",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/clauberg.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Pepeljugoski:2003:DOC,
  author =       "P. K. Pepeljugoski and D. M. Kuchta",
  title =        "Design of optical communications data links",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "223--237",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/pepeljugoski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Bona:2003:SHR,
  author =       "G.-L. Bona and R. Germann and B. J. Offrein",
  title =        "{SiON} high-refractive-index waveguide and planar
                 lightwave circuits",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "239--249",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/bona.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Trewhella:2003:EOS,
  author =       "J. M. Trewhella and G. W. Johnson and W. K. Hogan and
                 D. L. Karst",
  title =        "Evolution of optical subassemblies in {IBM} data
                 communication transceivers",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "251--258",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/trewhella.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Friedman:2003:SBI,
  author =       "D. J. Friedman and M. Meghelli and B. D. Parker and J.
                 Yang and H. A. Ainspan and A. V. Rylyakov and Y. H.
                 Kwark and M. B. Ritter and L. Shan and S. J. Zier and
                 M. Sorna and M. Soyuer",
  title =        "{SiGe BiCMOS} integrated circuits for high-speed
                 serial communication links",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "259--282",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/friedman.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Kosonocky:2003:LPC,
  author =       "S. V. Kosonocky and A. J. Bhavnagarwala and K. Chin
                 and G. D. Gristede and A.-M. Haen and W. Hwang and M.
                 B. Ketchen and S. Kim and D. R. Knebel and K. W. Warren
                 and V. Zyuban",
  title =        "Low-power circuits and technology for wireless digital
                 systems",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "283--298",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/kosonocky.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Moreno:2003:ILP,
  author =       "J. H. Moreno and V. Zyuban and U. Shvadron and F. D.
                 Neeser and J. H. Derby and M. S. Ware and K. Kailas and
                 A. Zaks and A. Geva and S. Ben-David and S. W. Asaad
                 and T. W. Fox and D. Littrell and M. Biberstein and D.
                 Naishlos and H. Hunter",
  title =        "An innovative low-power high-performance programmable
                 signal processor for digital communications",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "299--326",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/moreno.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Chevillat:2003:BRL,
  author =       "P. R. Chevillat and W. Schott",
  title =        "Broadband radio {LANs} and the evolution of wireless
                 beyond {$3$G}",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "327--336",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/chevillat.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Reynolds:2003:DCR,
  author =       "S. K. Reynolds and B. A. Floyd and T. J. Beukema and
                 T. Zwick and U. R. Pfeiffer and H. A. Ainspan",
  title =        "A direct-conversion receiver integrated circuit for
                 {WCDMA} mobile systems",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "337--353",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/reynolds.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Liu:2003:DIA,
  author =       "D. Liu and B. P. Gaucher and E. B. Flint and T. W.
                 Studwell and H. Usui and T. J. Beukema",
  title =        "Developing integrated antenna subsystems for laptop
                 computers",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "355--367",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/liu.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Meyerson:2003:MVP,
  author =       "Bernard S. Meyerson",
  title =        "Message from the {Vice President for Technology and
                 Chief Technologist, IBM Technology Group}",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "2/3",
  pages =        "??--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Jun 28 14:47:05 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/472/message.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0235",
}

@Article{Bradshaw:2003:P,
  author =       "Richard Bradshaw",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "371--372",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Bradshaw:2003:FYI,
  author =       "R. Bradshaw and C. Schroeder",
  title =        "Fifty years of {IBM} innovation with information
                 storage on magnetic tape",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "373--383",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/bradshaw.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Biskeborn:2003:HDD,
  author =       "R. G. Biskeborn and J. H. Eaton",
  title =        "Hard-disk-drive technology flat heads for linear tape
                 recording",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "385--400",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/biskeborn.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Iben:2003:SST,
  author =       "I. E. T. Iben and Y.-M. Lee and W. D. Hsiao",
  title =        "Steady-state thermal characteristics of {AMR}
                 read\slash write heads used in tape storage drives",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "401--414",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/lee.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Iben:2003:HRA,
  author =       "I. E. T. Iben",
  title =        "Head reliability of {AMR} sensors based on thermal
                 stress tests",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "415--428",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/iben.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Jaquette:2003:LBF,
  author =       "G. A. Jaquette",
  title =        "{LTO}: a better format for mid-range tape",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "429--444",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/jaquette.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Hellman:2003:ITS,
  author =       "D. J. Hellman and R. Yardy and P. E. Abbott",
  title =        "Innovations in tape storage automation at {IBM}",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "445--452",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/hellman.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Deicke:2003:TMS,
  author =       "J. Deicke and W. Mueller",
  title =        "Tape management in a storage networking environment",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "453--457",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/deicke.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Kishi:2003:IVT,
  author =       "G. T. Kishi",
  title =        "The {IBM Virtual Tape Server}: Making tape controllers
                 more autonomic",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "459--469",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/kishi.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Childers:2003:SOM,
  author =       "E. R. Childers and W. Imaino and J. H. Eaton and G. A.
                 Jaquette and P. V. Koeppe and D. J. Hellman",
  title =        "Six orders of magnitude in linear tape technology: The
                 one-terabyte project",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "471--482",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/childers.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Ortega:2003:GED,
  author =       "A. Ortega and A. A. Dalhoum and M. Alfonseca",
  title =        "Grammatical evolution to design fractal curves with a
                 given dimension",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "483--493",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/ortega.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Matick:2003:CAP,
  author =       "R. E. Matick",
  title =        "Comparison of analytic performance models using closed
                 mean-value analysis versus open-queuing theory for
                 estimating cycles per instruction of memory
                 hierarchies",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "4",
  pages =        "495--517",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Aug 7 13:37:16 MDT 2003",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/474/matick.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0236",
}

@Article{Elnozahy:2003:P,
  author =       "G. N. Elnozahy and R. Joshis",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "521--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Nakagome:2003:RFP,
  author =       "Y. Nakagome and M. Horiguchi and T. Kawahara and K.
                 Itoh",
  title =        "Review and future prospects of low-voltage {RAM}
                 circuits",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "525--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/nakagome.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Mann:2003:UPS,
  author =       "R. W. Mann and W. W. Abadeer and M. J. Breitwisch and
                 O. Bula and J. S. Brown and B. C. Colwill and P. E.
                 Cottrell and W. T. Crocco and S. S. Furkay and M. J.
                 Hauser and T. B. Hook and D. Hoyniak and J. M. Johnson
                 and C. M. Lam and R. D. Mih and J. Rivard and A.
                 Moriwaki and E. Phipps and C. S. Putnam and B. A.
                 Rainey and J. J. Toomey and M. I. Younus",
  title =        "Ultralow-power {SRAM} technology",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "553--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/mann.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Oklobdzija:2003:CSE,
  author =       "V. G. Oklobdzija",
  title =        "Clocking and storage elements in a multi-gigahertz
                 environment",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "567--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/oklobdzija.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Zyuban:2003:BHI,
  author =       "V. Zyuban and P. N. Strenski",
  title =        "Balancing hardware intensity in microprocessor
                 pipelines",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "585--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/zyuban.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Kim:2003:FGR,
  author =       "S. Kim and C. H. Ziesler and M. C. Papaefthymiou",
  title =        "Fine-grain real-time reconfigurable pipelining",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "599--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/kim.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Plouchart:2003:ASM,
  author =       "J.-O. Plouchart and N. Zamdmer and J. Kim and M.
                 Sherony and Y. Tan and A. Ray and M. Talbi and L. F.
                 Wagner and K. Wu and N. E. Lustig and S. Narasimha and
                 P. O'Neil and N. Phan and M. Rohn and J. Strom and D.
                 M. Friend and S. V. Kosonocky and D. R. Knebel and S.
                 Kim and K. A. Jenkins and M. M. Rivier",
  title =        "Application of an {SOI} 0.12-$\mu$m {CMOS} technology
                 to {SoCs} with low-power and high-frequency circuits",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "611--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/plouchart.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Nowka:2003:DAP,
  author =       "K. J. Nowka and G. D. Carpenter and B. C. Brock",
  title =        "The design and application of the {PowerPC 405LP}
                 energy-efficient system-on-a-chip",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "631--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/nowka.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Shafi:2003:DVP,
  author =       "H. Shafi and P. J. Bohrer and J. Phelan and C. A. Rusu
                 and J. L. Peterson",
  title =        "Design and validation of a performance and power
                 simulator for {PowerPC} systems",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "641--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/shafi.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Brooks:2003:NME,
  author =       "D. Brooks and P. Bose and V. Srinivasan and M. K.
                 Gschwind and P. G. Emma and M. G. Rosenfield",
  title =        "New methodology for early-stage,
                 microarchitecture-level power-performance analysis of
                 microprocessors",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "653--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/brooks.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Felter:2003:PUD,
  author =       "W. M. Felter and T. W. Keller and M. D. Kistler and C.
                 Lefurgy and K. Rajamani and R. Rajamony and F. L.
                 Rawson and B. A. Smith and E. {Van Hensbergen}",
  title =        "On the performance and use of dense servers",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "671--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/felter.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Rusu:2003:MSV,
  author =       "C. A. Rusu and R. Melhem and D. Moss{\'e}",
  title =        "Maximizing the system value while satisfying time and
                 energy constraints",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "689--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/rusu.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Bradley:2003:WBP,
  author =       "D. J. Bradley and R. E. Harper and S. W. Hunter",
  title =        "Workload-based power management for parallel computer
                 systems",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "703--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/bradley.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Anonymous:2003:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 47",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "719--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/authv47.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Anonymous:2003:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 47",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "725--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/subjv47.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{Rosenfield:2003:MDA,
  author =       "Michael G. Rosenfield",
  title =        "Message from the {Director, Austin Research
                 Laboratory, IBM Research Division}",
  journal =      j-IBM-JRD,
  volume =       "47",
  number =       "5/6",
  pages =        "??--??",
  month =        "????",
  year =         "2003",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/475/message.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0237",
}

@Article{DiVincenzo:2004:P,
  author =       "D. DiVincenzo and N. Amer",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "3--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Grinstein:2004:CCS,
  author =       "G. Grinstein",
  title =        "Can complex structures be generically stable in a
                 noisy world?",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "5--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/grinstein.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Toffoli:2004:PIS,
  author =       "T. Toffoli",
  title =        "A pedestrian's introduction to spacetime
                 crystallography",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "13--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/toffoli.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Fredkin:2004:FBQ,
  author =       "E. Fredkin",
  title =        "Five big questions with pretty simple answers",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "31--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/fredkin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Smolin:2004:EDE,
  author =       "J. A. Smolin",
  title =        "The early days of experimental quantum cryptography",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "47--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/smolin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Mermin:2004:CCH,
  author =       "N. D. Mermin",
  title =        "{Copenhagen} computation: How {I} learned to stop
                 worrying and love {Bohr}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "53--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/mermin.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Peres:2004:WAT,
  author =       "A. Peres",
  title =        "What is actually teleported?",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "63--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/peres.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Terhal:2004:EM,
  author =       "B. M. Terhal",
  title =        "Is entanglement monogamous?",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "71--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/terhal.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Jozsa:2004:ICQ,
  author =       "R. Jozsa",
  title =        "Illustrating the concept of quantum information",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "79--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/jozsa.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Brassard:2004:TGQ,
  author =       "G. Brassard and P. Horodecki and T. Mor",
  title =        "{TelePOVM} --- a generalized quantum teleportation
                 scheme",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "87--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/brassard.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Wootters:2004:PQP,
  author =       "W. K. Wootters",
  title =        "Picturing qubits in phase space",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "99--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/wootters.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Ruskai:2004:SBS,
  author =       "M. B. Ruskai",
  title =        "Some bipartite states do not arise from channels",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "111--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/ruskai.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Shor:2004:ACC,
  author =       "P. W. Shor",
  title =        "The adaptive classical capacity of a quantum channel,
                 or Information capacities of three symmetric pure
                 states in three dimensions",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "115--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/shor.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Horodecki:2004:QII,
  author =       "R. Horodecki and M. Horodecki and P. Horodecki",
  title =        "Quantum information isomorphism: Beyond the dilemma of
                 the {Scylla} of ontology and the {Charybdis} of
                 instrumentalism",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "1",
  pages =        "139--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 27 05:37:12 MST 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/481/horodecki.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0238",
}

@Article{Agerwala:2004:MVP,
  author =       "Tilak Agerwala",
  title =        "Message from the {Vice President, Systems, IBM
                 Research Division}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.a",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Jordan:2004:P,
  author =       "Kirk E. Jordan",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "151--152",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0151",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Crivelli:2004:NLB,
  author =       "S. Crivelli and T. Head-Gordon",
  title =        "A new load-balancing strategy for the solution of
                 dynamical large-tree-search problems using a
                 hierarchical approach",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "153--160",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0153",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/crivelli.html;
                 http://www.research.ibm.com/journal/rd/482/crivelli.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Fann:2004:SOM,
  author =       "G. Fann and G. Beylkin and R. J. Harrison and K. E.
                 Jordan",
  title =        "Singular operators in multiwavelet bases",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "161--172",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0161",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/fann.html;
                 http://www.research.ibm.com/journal/rd/482/fann.pdf",
  abstract =     "We review some recent results on multiwavelet methods
                 for solving integral and partial differential equations
                 and present an efficient representation of operators
                 using discontinuous multiwavelet bases, including the
                 case for singular integral operators. Numerical
                 calculus using these representations produces fast
                 $O(N)$ methods for multiscale solution of integral
                 equations when combined with low separation rank
                 methods. Using this formulation, we compute the Hilbert
                 transform and solve the Poisson and Schr{\"o}dinger
                 equations. For a fixed order of multiwavelets and for
                 arbitrary but finite precision computations, the
                 computational complexity is $O(N)$. The computational
                 structures are similar to fast multipole methods but
                 are more generic in yielding fast $O(N)$ algorithm
                 development.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Newns:2004:NET,
  author =       "D. M. Newns and W. E. Donath and G. J. Martyna and M.
                 E. Schabes and B. H. {Lengsfield III}",
  title =        "Novel efficient techniques for computer simulation of
                 magnetic recording",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "173--182",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0173",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/newns.html;
                 http://www.research.ibm.com/journal/rd/482/newns.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Lake:2004:PWN,
  author =       "G. Lake and T. Quinn and D. C. Richardson and J.
                 Stadel",
  title =        "The pursuit of the whole {NChilada}: Virtual petaflops
                 using multi-adaptive algorithms for gravitational
                 systems",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "183--198",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0183",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/lake.html;
                 http://www.research.ibm.com/journal/rd/482/lake.pdf",
  abstract =     "``The orbit of any one planet depends on the combined
                 motion of all the other planets, not to mention the
                 actions of all these on each other. To consider
                 simultaneously all these causes of motion and to define
                 these motions by exact laws allowing of convenient
                 calculation exceeds, unless I am mistaken, the forces
                 of the entire human intellect.'' --- Isaac Newton,
                 1687\par

                 We describe the keys to meeting the challenges of
                 $N$-body simulation: adaptive potential solvers,
                 adaptive integration, and volume renormalization. With
                 these techniques and a dedicated teraflop facility,
                 simulation can keep pace with observations of the
                 universe. We also describe some problems in simulating
                 the formation and stability of planetary systems.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Elmegreen:2004:SMM,
  author =       "B. G. Elmegreen and R. H. Koch and M. E. Schabes and
                 T. Crawford and T. Ebisuzaki and H. Furusawa and T.
                 Narumi and R. Susukita and K. Yasuoka",
  title =        "Simulations of magnetic materials with {MDGRAPE-2}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "199--207",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0199",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/elmegreen.html;
                 http://www.research.ibm.com/journal/rd/482/elmegreen.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Kramer:2004:DSC,
  author =       "W. T. C. Kramer and A. Shoshani and D. A. Agarwal and
                 B. R. Draney and G. Jin and G. F. Butler and J. A.
                 Hules",
  title =        "Deep scientific computing requires deep data",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "209--232",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0209",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/kramer.html;
                 http://www.research.ibm.com/journal/rd/482/kramer.pdf",
  abstract =     "Increasingly, scientific advances require the fusion
                 of large amounts of complex data with extraordinary
                 amounts of computational power. The problems of deep
                 science demand deep computing and deep storage
                 resources. In addition to teraflop-range computing
                 engines with their own local storage, facilities must
                 provide large data repositories of the order of 10--100
                 petabytes, and networking to allow the movement of
                 multi-terabyte files in a timely and secure manner.
                 This paper examines such problems and identifies
                 associated challenges. The paper discusses some of the
                 storage systems and data management methods that are
                 needed for computing facilities to address the
                 challenges and describes some ongoing improvements.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Grimshaw:2004:PTC,
  author =       "A. S. Grimshaw and M. A. Humphrey and A. Natrajan",
  title =        "A philosophical and technical comparison of {Legion}
                 and {Globus}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "233--254",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0233",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/grimshaw.html;
                 http://www.research.ibm.com/journal/rd/482/grimshaw.pdf",
  abstract =     "Grids are collections of interconnected resources
                 harnessed to satisfy various needs of users. Legion and
                 Globus are pioneering grid technologies. Several of the
                 aims and goals of both projects are similar, yet their
                 underlying architectures and philosophies differ
                 substantially. The scope of both projects is the
                 creation of worldwide grids; in that respect, they
                 subsume several distributed systems technologies.
                 However, Legion has been designed as a virtual
                 operating system (OS) for distributed resources with
                 OS-like support for current and expected future
                 interactions among resources, whereas Globus has long
                 been designed as a sum of services infrastructure, in
                 which tools are developed independently in response to
                 current needs of users. We compare and contrast Legion
                 and Globus in terms of their underlying philosophy and
                 the resulting architectures, and we discuss how these
                 projects converge in the context of the new standards
                 being formulated for grids.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Hsu:2004:PIO,
  author =       "W. W. Hsu and A. J. Smith",
  title =        "The performance impact of {I/O} optimizations and disk
                 improvements",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "2",
  pages =        "255--289",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.482.0255",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:39 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/482/hsu.html;
                 http://www.research.ibm.com/journal/rd/482/hsu.pdf",
  abstract =     "In this paper, we use real server and personal
                 computer workloads to systematically analyze the true
                 performance impact of various I/O optimization
                 techniques, including read caching, sequential
                 prefetching, opportunistic prefetching, write
                 buffering, request scheduling, striping, and
                 short-stroking. We also break down disk technology
                 improvement into four basic effects faster seeks,
                 higher RPM, linear density improvement, and increase in
                 track density and analyze each separately to determine
                 its actual benefit. In addition, we examine the
                 historical rates of improvement and use the trends to
                 project the effect of disk technology scaling. As part
                 of this study, we develop a methodology for replaying
                 real workloads that more accurately models I/O arrivals
                 and that allows the I/O rate to be more realistically
                 scaled than previously. We find that optimization
                 techniques that reduce the number of physical I/Os are
                 generally more effective than those that improve the
                 efficiency in performing the I/Os. Sequential
                 prefetching and write buffering are particularly
                 effective, reducing the average read and write response
                 time by about 50\% and 90\%, respectively. Our results
                 suggest that a reliable method for improving
                 performance is to use larger caches up to and even
                 beyond 1\% of the storage used. For a given workload,
                 our analysis shows that disk technology improvement at
                 the historical rate increases performance by about 8\%
                 per year if the disk occupancy rate is kept constant,
                 and by about 15\% per year if the same number of disks
                 are used. We discover that the actual average seek time
                 and rotational latency are, respectively, only about
                 35\% and 60\% of the specified values. We also observe
                 that the disk head positioning time far dominates the
                 data transfer time, suggesting that to effectively
                 utilize the available disk bandwidth, data should be
                 reorganized such that accesses become more
                 sequential.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0239",
}

@Article{Desens:2004:MVP,
  author =       "Michael Desens",
  title =        "Message from the {Vice President, Systems Hardware
                 Development, IBM Systems and Technology Group}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "??--??",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.a",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/message.html;
                 http://www.research.ibm.com/journal/rd/483/message.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Schmidt:2004:P,
  author =       "Rolf Schmidt",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "293--294",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0293",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/preface.html;
                 http://www.research.ibm.com/journal/rd/483/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Slegel:2004:IEZ,
  author =       "T. J. Slegel and E. Pfeffer and J. A. Magee",
  title =        "The {IBM eServer z990} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "295--310",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0295",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/slegel.html;
                 http://www.research.ibm.com/journal/rd/483/slegel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Gerwig:2004:IEZ,
  author =       "G. Gerwig and H. Wetter and E. M. Schwarz and J. Haess
                 and C. A. Krygowski and B. M. Fleischer and M.
                 Kroener",
  title =        "The {IBM eServer z990} floating-point unit",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "311--322",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0311",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/gerwig.html;
                 http://www.research.ibm.com/journal/rd/483/gerwig.pdf",
  abstract =     "The floating-point unit (FPU) of the IBM z990 eServer
                 is the first one in an IBM mainframe with a fused
                 multiply-add dataflow. It also represents the first
                 time that an SRT divide algorithm (named after Sweeney,
                 Robertson, and Tocher, who independently proposed the
                 algorithm) was used in an IBM mainframe. The FPU
                 supports dual architectures: the zSeries hexadecimal
                 floating-point architecture and the IEEE 754 binary
                 floating-point architecture. Six floating-point formats
                 including short, long, and extended operands are
                 supported in hardware. The throughput of this FPU is
                 one multiply-add operation per cycle. The instructions
                 are executed in five pipeline steps, and there are
                 multiple provisions to avoid stalls in case of data
                 dependencies. It is able to handle denormalized input
                 operands and denormalized results without a stall
                 (except for architectural program exceptions). It has a
                 new extended-precision divide and square-root dataflow.
                 This dataflow uses a radix-4 SRT algorithm (radix-2 for
                 square root) and is able to handle divides and
                 square-root operations in multiple floating-point and
                 fixed-point formats. For fixed-point divisions, a new
                 mechanism improves the performance by using an
                 algorithm with which the number of divide iterations
                 depends on the effective number of quotient bits.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Mak:2004:PSI,
  author =       "P. Mak and G. E. Strait and M. A. Blake and K. W. Kark
                 and V. K. Papazova and A. E. Seigler and G. A. {Van
                 Huben} and L. Wang and G. C. Wellwood",
  title =        "Processor subsystem interconnect architecture for a
                 large symmetric multiprocessing system",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "323--338",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0323",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/mak.html;
                 http://www.research.ibm.com/journal/rd/483/mak.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Webel:2004:RCM,
  author =       "T. Webel and T. E. Gilbert and D. Schmunkamp",
  title =        "Run-control migration from single book to multibooks",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "339--346",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0339",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/webel.html;
                 http://www.research.ibm.com/journal/rd/483/webel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Bair:2004:FVZ,
  author =       "D. G. Bair and S. M. German and W. D. Wollyung and E.
                 J. {Kaminski, Jr.} and J. Schafer and M. P. Mullen and
                 W. J. Lewis and R. Wisniewski and J. Walter and S.
                 Mittermaier and V. Vokhshoori and R. J. Adkins and M.
                 Halas and T. Ruane and U. Hahn",
  title =        "Functional verification of the {z990} superscalar,
                 multibook microprocessor complex",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "347--365",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0347",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/bair.html;
                 http://www.research.ibm.com/journal/rd/483/bair.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Anderson:2004:CSS,
  author =       "H.-W. Anderson and H. Kriese and W. Roesner and K.-D.
                 Schubert",
  title =        "Configurable system simulation model build comprising
                 packaging design data",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "367--378",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/anderson.html;
                 http://www.research.ibm.com/journal/rd/483/anderson.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Winkel:2004:FSL,
  author =       "T.-M. Winkel and W. D. Becker and H. Harrer and H.
                 Pross and D. Kaller and B. Garben and B. J. Chamberlin
                 and S. A. Kuppinger",
  title =        "First- and second-level packaging of the {z990}
                 processor cage",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "379--394",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/winkel.html;
                 http://www.research.ibm.com/journal/rd/483/winkel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Parrilla:2004:PIE,
  author =       "J. C. Parrilla and F. E. Bosco and J. S. Corbin and J.
                 J. Loparco and P. Singh and J. G. Torok",
  title =        "Packaging the {IBM eServer z990} central electronic
                 complex",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "395--407",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0395",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/parrilla.html;
                 http://www.research.ibm.com/journal/rd/483/parrilla.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Goth:2004:HCC,
  author =       "G. F. Goth and D. J. Kearney and U. Meyer and D. W.
                 Porter",
  title =        "Hybrid cooling with cycle steering in the {IBM eServer
                 z990}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "409--423",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0409",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/goth.html;
                 http://www.research.ibm.com/journal/rd/483/goth.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Heller:2004:MIZ,
  author =       "L. C. Heller and M. S. Farrell",
  title =        "Millicode in an {IBM zSeries} processor",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "425--434",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0425",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/heller.html;
                 http://www.research.ibm.com/journal/rd/483/heller.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Axnix:2004:ZNP,
  author =       "C. Axnix and E. Engler and S. Hegewald and T. Hesmer
                 and M. Kuenzel and F. M. Welter",
  title =        "{z990 NetMessage}-protocol-based processor to support
                 element communication interface",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "435--447",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0435",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/axnix.html;
                 http://www.research.ibm.com/journal/rd/483/axnix.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Chencinski:2004:SCL,
  author =       "E. W. Chencinski and M. J. Becht and T. E. Bubb and C.
                 G. Burwick and J. Haess and M. M. Helms and J. M. Hoke
                 and T. Schlipf and J. M. Turner and H. Ulland and M. H.
                 Walz and C. H. Whitehead and G. Zilles",
  title =        "The structure of chips and links comprising the {IBM
                 eServer z990 I/O} subsystem",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "449--459",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0449",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/chencinski.html;
                 http://www.research.ibm.com/journal/rd/483/chencinski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Hoppe:2004:FVF,
  author =       "B. Hoppe and B. Arthur-Mensah and E. W. Chencinski and
                 S. Joseph and H. Kumar and J. F. Silverio",
  title =        "Functional verification of a frequency-programmable
                 switch chip with asynchronous clock sections",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "461--474",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0461",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/hoppe.html;
                 http://www.research.ibm.com/journal/rd/483/hoppe.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Arnold:2004:IPN,
  author =       "T. W. Arnold and L. P. {Van Doorn}",
  title =        "The {IBM PCIXCC}: a new cryptographic coprocessor
                 for the {IBM eServer}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "475--487",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0475",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/arnold.html;
                 http://www.research.ibm.com/journal/rd/483/arnold.pdf",
  abstract =     "IBM has designed special cryptographic processors for
                 its servers for more than 25 years. These began as very
                 simple devices, but over time the requirements have
                 become increasingly complex, and there has been a
                 never-ending demand for increased speed. This paper
                 describes the PCIXCC, the new coprocessor introduced in
                 the IBM z990 server. In many ways, PCIXCC is a
                 watershed design. For the first time, a single product
                 satisfies all requirements across all IBM server
                 platforms. It offers the performance demanded by
                 today's Web servers, it supports the complex and
                 specialized cryptographic functions needed in the
                 banking and finance industry, and it uses packaging
                 technology that leads the world in resistance to
                 physical or electrical attacks against its secure
                 processes and the secret data it holds. Furthermore, it
                 is programmable and highly flexible, so that its
                 function can be easily modified to meet new
                 requirements as they appear. These features are
                 possible because of innovative design in both the
                 hardware and embedded software for the card. This paper
                 provides an overview of that design.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
  remark =       "From the paper: ``Random-number generator: The card
                 includes two cryptographic-quality hardware
                 random-number generators. The entropy is obtained from
                 electrical noise from a semiconductor junction. Each of
                 the two random-number sources provides random bits at a
                 rate of 128 Kb/s.''\par

                 Linux operating system and device drivers: \ldots{} By
                 adopting Linux as the card O/S, the PCIXCC development
                 team could focus more of its energy on the unique
                 PCIXCC components. \ldots{} In the end, we decided to
                 provide all device driver modules under the same
                 license as the Linux kernel, the GNU General Public
                 License (GPL).",
}

@Article{Wyman:2004:MLC,
  author =       "L. W. Wyman and H. M. Yudenfriend and J. S. Trotter
                 and K. J. Oakes",
  title =        "Multiple-logical-channel subsystems: Increasing
                 {zSeries I/O} scalability and connectivity",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "489--505",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0489",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/wyman.html;
                 http://www.research.ibm.com/journal/rd/483/wyman.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Banzhaf:2004:SIP,
  author =       "G. Banzhaf and F. W. Brice and G. R. Frazier and J. P.
                 Kubala and T. B. Mathias and V. Sameske",
  title =        "{SCSI} initial program loading for {zSeries}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "507--518",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0507",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/banzhaf.html;
                 http://www.research.ibm.com/journal/rd/483/banzhaf.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Fair:2004:RAS,
  author =       "M. L. Fair and C. R. Conklin and S. B. Swaney and P.
                 J. Meaney and W. J. Clarke and L. C. Alves and I. N.
                 Modi and F. Freier and W. Fischer and N. E. Weber",
  title =        "Reliability, availability, and serviceability ({RAS})
                 of the {IBM eServer z990}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "519--534",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0519",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/fair.html;
                 http://www.research.ibm.com/journal/rd/483/fair.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Siegel:2004:LPM,
  author =       "I. G. Siegel and B. A. Glendening and J. P. Kubala",
  title =        "Logical partition mode physical resource management on
                 the {IBM eServer z990}",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "535--541",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0535",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/siegel.html;
                 http://www.research.ibm.com/journal/rd/483/siegel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Gellerich:2004:GBP,
  author =       "W. Gellerich and T. Hendel and R. Land and H. Lehmann
                 and M. Mueller and P. H. Oden and H. Penner",
  title =        "The {GNU} 64-bit {PL8} compiler: Toward an open
                 standard environment for firmware development",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "543--556",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0543",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/gellerich.html;
                 http://www.research.ibm.com/journal/rd/483/gellerich.pdf",
  abstract =     "For two decades, large parts of zSeries firmware have
                 been written in the PL8 programming language. The
                 existence of a large amount of mature zSeries firmware
                 source code and our excellent experience with PL8 for
                 system programming suggest keeping this language.
                 However, the firmware address space of today's zSeries
                 servers may exceed 2 GB, raising the need for a new
                 64-bit PL8 compiler, since the original implementation,
                 developed at the IBM Thomas J. Watson Research Center,
                 Yorktown Heights, New York, supports only 32-bit
                 platforms. The GNU compiler collection (GCC) (GNU is a
                 freeware UNIX -like operating system) has been used to
                 translate those parts of firmware written in C for some
                 years and has also proved successful in compiling Linux
                 for zSeries. This fact, combined with the highly
                 modular GCC design, suggested reimplementing PL8 within
                 the GCC framework. In this paper, we report on the
                 extension of PL8 to support 64-bit addressing, its
                 implementation as a GCC front end, and the validation
                 of the new compiler. We also evaluate PL8 as a language
                 for highly reliable low-level programming and give some
                 performance data. The paper documents the high level of
                 quality achieved by the GCC open-source project and how
                 such software fits into the traditional IBM software
                 development processes.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Koerner:2004:ZFE,
  author =       "S. Koerner and R. Bawidamann and W. Fischer and U.
                 Helmich and D. Klodt and B. K. Tolan and P. Wojciak",
  title =        "The {z990} first error data capture concept",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "557--568",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0557",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/koerner.html;
                 http://www.research.ibm.com/journal/rd/483/koerner.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Schubert:2004:ASI,
  author =       "K.-D. Schubert and E. C. McCain and H. Pape and K.
                 Rebmann and P. M. West and R. Winkelmann",
  title =        "Accelerating system integration by enhancing hardware,
                 firmware, and co-simulation",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "569--581",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0569",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/schubert.html;
                 http://www.research.ibm.com/journal/rd/483/schubert.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Stetter:2004:IEZ,
  author =       "M. Stetter and J. von Buttlar and P. T. Chan and D.
                 Decker and H. Elfering and P. M. Gioquindo and T. Hess
                 and S. Koerner and A. Kohler and H. Lindner and K.
                 Petri and M. Zee",
  title =        "{IBM eServer z990} improvements in firmware
                 simulation",
  journal =      j-IBM-JRD,
  volume =       "48",
  number =       "3/4",
  pages =        "583--594",
  month =        "????",
  year =         "2004",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.483.0583",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 28 06:50:40 MDT 2004",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/483/stetter.html;
                 http://www.research.ibm.com/journal/rd/483/stetter.pdf",
  abstract =     "With the IBM eServer z900, simulation methods and
                 tools for verification of code that is to be embedded
                 in the memory of the system (firmware) were introduced.
                 Since that time, firmware developers have simulated
                 their code prior to the availability of new system
                 hardware components, thereby reducing the time required
                 to bring a large computer system to market. With the
                 z990 system, code simulation efficiency has been
                 improved. The simulation coverage for host and service
                 firmware has been increased from approximately 60\% in
                 the z900 to 85\% in the z990 by introducing new concepts
                 and extensions. For the first time, the central
                 electronic complex (CEC) firmware simulator, CECSIM,
                 has been enabled to run code in a logical partition
                 (LPAR). This was a prerequisite for code verification
                 of the intra-CEC connectivity, HiperSockets. For
                 verification of HiperSockets, a Linux operating system
                 is loaded into an LPAR. Code verification is
                 accomplished more easily, more effectively, and with
                 better coverage using Linux debugging features because
                 of the ease of performing functional tests with Linux.
                 Another major improvement was the connection of the
                 channel code simulator for the networking I/O adapter
                 OSA-Express to the CECSIM environment to provide a
                 comprehensive verification that covers the entire path
                 of firmware interaction between the CEC and the I/O
                 channels. For the simulation of card control code, a
                 combined software and hardware verification approach
                 was introduced. The overall functionality was verified
                 with a system simulation model, and the base hardware
                 accesses were verified by attaching real hardware. In
                 addition, the cage controller code was integrated into
                 the simulation environment. As a result, the firmware
                 interfaces between the support element (SE) and the
                 cage controller as well as between the cage controller
                 and the hardware have been tested.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Anonymous:2005:EN,
  author =       "Anonymous",
  title =        "Editor's Note",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/note.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
  remark =       "This issue is dedicated to the late Dr. Panayotis
                 Andricacos of the IBM Thomas J. Watson Research Center,
                 who played a pioneering role in the development of
                 copper electrodeposition for semiconductor on-chip
                 wiring.",
}

@Article{Vereecken:2005:CAD,
  author =       "P. M. Vereecken and R. A. Binstead and H. Deligianni
                 and P. C. Andricacos",
  title =        "The chemistry of additives in damascene copper
                 plating",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "3--18",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/vereecken.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Moffat:2005:SFG,
  author =       "T. P. Moffat and D. Wheeler and M. D. Edelstein and D.
                 Josell",
  title =        "Superconformal film growth: Mechanism and
                 quantification",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "19--36",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/moffat.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{West:2005:EPI,
  author =       "A. C. West and H. Deligianni and P. C. Andricacos",
  title =        "Electrochemical planarization of interconnect
                 metallization",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "37--48",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/west.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Drews:2005:MSC,
  author =       "T. O. Drews and S. Krishnan and J. C. {Alameda, Jr.}
                 and D. Gannon and R. D. Braatz and R. C. Alkire",
  title =        "Multiscale simulations of copper electrodeposition
                 onto a resistive substrate",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "49--63",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/drews.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Ritzdorf:2005:DME,
  author =       "T. L. Ritzdorf and G. J. Wilson and P. R. McHugh and
                 D. J. Woodruff and K. M. Hanson and D. Fulton",
  title =        "Design and modeling of equipment used in
                 electrochemical processes for microelectronics",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "65--77",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/ritzdorf.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Sun:2005:TPM,
  author =       "L. Sun and Y. Hao and C.-L. Chien and P. C. Searson",
  title =        "Tuning the properties of magnetic nanowires",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "79--102",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/sun.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Cooper:2005:RDH,
  author =       "E. I. Cooper and C. Bonh{\^o}te and J. Heidmann and Y.
                 Hsu and P. Kern and J. Lam and M. Ramasubramanian and
                 N. Robertson and L. T. Romankiw and H. Xu",
  title =        "Recent developments in high-moment electroplated
                 materials for recording heads",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "103--126",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/cooper.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Emma:2005:ELP,
  author =       "P. G. Emma and A. Hartstein and T. R. Puzak and V.
                 Srinivasan",
  title =        "Exploring the limits of prefetching",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "127--144",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/emma.pdf",
  abstract =     "We formulate a new approach for evaluating a
                 prefetching algorithm. We first carry out a profiling
                 run of a program to identify all of the misses and
                 corresponding locations in the program where prefetches
                 for the misses can be initiated. We then systematically
                 control the number of misses that are prefetched, the
                 timeliness of these prefetches, and the number of
                 unused prefetches. We validate the accuracy of our
                 approach by comparing it to one based on a Markov
                 prefetch algorithm. This allows us to measure the
                 potential benefit that any application can receive from
                 prefetching and to analyze application behavior under
                 conditions that cannot be explored with any known
                 prefetching algorithm. Next, we analyze a system
                 parameter that is vital to prefetching performance, the
                 line transfer interval, which is the number of
                 processor cycles required to transfer a cache line.
                 This interval is determined by technology and
                 bandwidth. We show that under ideal conditions,
                 prefetching can remove nearly all of the stalls
                 associated with cache misses. Unfortunately, real
                 processor implementations are less than ideal. In
                 particular, the trend in processor frequency is
                 outrunning on-chip and off-chip bandwidths. Today, it
                 is not uncommon for processor frequency to be three or
                 four times bus frequency. Under these conditions, we
                 show that nearly all of the performance benefits
                 derived from prefetching are eroded, and in many cases
                 prefetching actually degrades performance. We carry out
                 quantitative and qualitative analyses of these
                 tradeoffs and show that there is a linear relationship
                 between overall performance and three metrics:
                 percentage of misses prefetched, percentage of unused
                 prefetches, and bandwidth.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
  remark =       "From p. 142: ``In many processors today, line sizes
                 are modest (e.g., 32 bytes), bus widths are
                 sufficiently matched to the line size (e.g., 8 bytes),
                 and processor frequency is comparable to bus frequency
                 (e.g., 1:1 or 2:1). For such systems, the LTI is small
                 (e.g., four cycles) but still measurable. However, the
                 factors that drive packaging technology and logic speed
                 and density will cause LTI to increase, resulting in
                 serious effects that could render prefetching useless.
                 We have shown this trend even at high levels of
                 coverage and accuracy.''",
}

@Article{Matick:2005:LBE,
  author =       "R. E. Matick and S. E. Schuster",
  title =        "Logic-based {eDRAM}: Origins and rationale for use",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "145--165",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/matick.pdf",
  abstract =     "The IBM logic-based eDRAM (embedded DRAM) technology
                 integrates a trench DRAM (dynamic random access memory)
                 storage-cell technology into a logic-circuit
                 technology, merging the two previously separate
                 technologies. Since its introduction in the 1970s, the
                 DRAM technology has been driven by cost while the logic
                 technology has been driven by speed, leading to an
                 ever-widening gap between slower memory and faster
                 logic devices. That has led to the need for
                 increasingly complex levels of memory hierarchies,
                 resulting in considerable degradation of system
                 performance despite many design and architecture
                 compromises. DRAM can provide six to eight times as
                 much memory as SRAM (static random access memory) in
                 the same area, but has been too slow to be used at any
                 cache level. Our studies, highlighted in this paper,
                 indicated that the use of logic-based DRAM could
                 resolve that difficulty and was necessary for
                 integrating systems on a chip. This has led to the
                 inclusion of logic-based eDRAM as a memory option in
                 the IBM ASICs (application-specific integrated
                 circuits) product.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Buti:2005:OIR,
  author =       "T. N. Buti and R. G. McDonald and Z. Khwaja and A.
                 Ambekar and H. Q. Le and W. E. Burky and B. Williams",
  title =        "Organization and implementation of the
                 register-renaming mapper for out-of-order {IBM POWER4}
                 processors",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "1",
  pages =        "167--188",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 07:50:44 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/491/buti.pdf",
  abstract =     "We present a new nonconventional approach for
                 designing and organizing register rename mappers that
                 can be applied in modern out-of-order processor chips.
                 A content-addressable memory (CAM) configuration
                 optimal for such a register mapper application was
                 developed. The structure of the CAM and search engine,
                 described in this paper, facilitates the implementation
                 of the register mapper as a group of custom arrays.
                 Each array is dedicated to executing a specific
                 function. Among the functions we implemented are
                 allocation of registers, maintaining the register map
                 and status, source lookup, saving a shadow copy of the
                 register map, and freeing up of registers. We made a
                 novel implementation of the register mapper to provide
                 rename resources for the IBM POWER4 chip, which
                 provides the processing power for the IBM eServer p690.
                 Such register renaming allows for a high level of
                 concurrency in the pipeline and contributes to superior
                 machine performance.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Agerwala:2005:MVP,
  author =       "Tilak Agerwala",
  title =        "Message from the {Vice President, Systems, IBM
                 Research Division}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "??--??",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "01 June 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/message.pdf",
  abstract =     "The Blue Gene program was announced in 1999, with the
                 long-term goal of creating a petascale supercomputer to
                 accelerate discovery in the life sciences. Five years
                 later, the team of IBM researchers and developers, in
                 collaboration with the Lawrence Livermore National
                 Laboratory, has delivered a computer (Blue Gene/L) that
                 not only ranks as the most powerful supercomputer in
                 the world, but introduces dramatic reductions in power
                 consumption, cost, and space requirements. A vigorous,
                 innovative, collaborative scientific research program
                 based on Blue Gene is now in place as well.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Chiu:2005:P,
  author =       "G. L.-T. Chiu and M. Gupta and A. K. Royyurus",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "191--193",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/preface.pdf",
  abstract =     "On November 8, 2004, a 16-rack, 16,384-node Blue
                 Gene/L supercomputer was crowned as the fastest
                 supercomputer in the world on the 24th TOP500 list
                 (http://www.top500.org). IBM was regarded as the most
                 innovative computer manufacturer. The sustained LINPACK
                 benchmark number for this Blue Gene/L was 70.72
                 teraflops (a trillion floating-point operations per
                 second), or 77\% of its peak performance of 91.75
                 teraflops.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Gara:2005:OBG,
  author =       "A. Gara and M. A. Blumrich and D. Chen and G. L.-T.
                 Chiu and P. Coteus and M. E. Giampapa and R. A. Haring
                 and P. Heidelberger and D. Hoenicke and G. V. Kopcsay
                 and T. A. Liebsch and M. Ohmacht and B. D.
                 Steinmacher-Burow and T. Takken and P. Vranas",
  title =        "Overview of the {Blue Gene/L} system architecture",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "195--212",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/gara.pdf",
  abstract =     "The Blue Gene/L computer is a massively parallel
                 supercomputer based on IBM system-on-a-chip technology.
                 It is designed to scale to 65,536 dual-processor nodes,
                 with a peak performance of 360 teraflops. This paper
                 describes the project objectives and provides an
                 overview of the system architecture that resulted. We
                 discuss our application-based approach and rationale
                 for a low-power, highly integrated design. The key
                 architectural features of Blue Gene/L are introduced in
                 this paper: the link chip component and five Blue
                 Gene/L networks, the PowerPC 440 core and
                 floating-point enhancements, the on-chip and off-chip
                 distributed memory system, the node- and system-level
                 design for high reliability, and the comprehensive
                 approach to fault isolation.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Coteus:2005:PBG,
  author =       "P. Coteus and H. R. Bickford and T. M. Cipolla and P.
                 G. Crumley and A. Gara and S. A. Hall and G. V. Kopcsay
                 and A. P. Lanzetta and L. S. Mok and R. Rand and R.
                 Swetz and T. Takken and P. La Rocca and C. Marroquin
                 and P. R. Germann and M. J. Jeanson",
  title =        "Packaging the {Blue Gene/L} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "213--248",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/coteus.pdf",
  abstract =     "As 1999 ended, IBM announced its intention to
                 construct a one peta flop supercomputer. The
                 construction of this system was based on a cellular
                 architecture the use of relatively small but powerful
                 building blocks used together in sufficient quantities
                 to construct large systems. The first step on the road
                 to a petaflop machine (one quadrillion floating-point
                 operations in a second) is the Blue Gene/L
                 supercomputer. Blue Gene/L combines a low-power
                 processor with a highly parallel architecture to
                 achieve unparalleled computing performance per unit
                 volume. Implementing the Blue Gene/L packaging involved
                 trading off considerations of cost, power, cooling,
                 signaling, electromagnetic radiation, mechanics,
                 component selection, cabling, reliability, service
                 strategy, risk, and schedule. This paper describes how
                 1,024 dual-processor compute application-specific
                 integrated circuits (ASICs) are packaged in a scalable
                 rack, and how racks are combined and augmented with
                 host computers and remote storage. The Blue Gene/L
                 interconnect, power, cooling, and control systems are
                 described individually and as part of the synergistic
                 whole.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Wait:2005:IPF,
  author =       "C. D. Wait",
  title =        "{IBM PowerPC 440 FPU} with complex-arithmetic
                 extensions",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "249--254",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/wait.pdf",
  abstract =     "The PowerPC 440 floating-point unit (FPU) with
                 complex-arithmetic extensions is an embedded
                 application-specific integrated circuit (ASIC) core
                 designed to be used with the IBM PowerPC 440 processor
                 core on the Blue Gene/L compute chip. The FPU core
                 implements the floating-point instruction set from the
                 PowerPC Architecture and the floating-point instruction
                 extensions created to aid in matrix and
                 complex-arithmetic operations. The FPU instruction
                 extensions define double-precision operations that are
                 primarily single-instruction multiple-data (SIMD) and
                 require two (primary and secondary) arithmetic
                 pipelines and floating-point register files. However,
                 to aid complex-arithmetic routines, some FPU extensions
                 actually perform different (yet closely related)
                 operations while executing in the arithmetic pipelines.
                 The FPU core implements an operand crossbar between the
                 primary and secondary arithmetic datapaths to enable
                 each pipeline operand access from the primary or
                 secondary register file. The PowerPC 440 processor core
                 provides 128-bit storage buses and simultaneous issue
                 of an arithmetic instruction with a storage
                 instruction, allowing the FPU core to fully utilize the
                 parallel arithmetic pipes.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Ohmacht:2005:BGC,
  author =       "M. Ohmacht and R. A. Bergamaschi and S. Bhattacharya
                 and A. Gara and M. E. Giampapa and B. Gopalsamy and R.
                 A. Haring and D. Hoenicke and D. J. Krolak and J. A.
                 Marcella and B. J. Nathanson and V. Salapura and M. E.
                 Wazlowski",
  title =        "{Blue Gene/L} compute chip: Memory and {Ethernet}
                 subsystem",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "255--264",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/ohmacht.pdf",
  abstract =     "The Blue Gene/L compute chip is a dual-processor
                 system-on-a-chip capable of delivering an arithmetic
                 peak performance of 5.6 gigaflops. To match the memory
                 speed to the high compute performance, the system
                 implements an aggressive three-level on-chip cache
                 hierarchy. The implemented hierarchy offers high
                 bandwidth and integrated prefetching on cache hierarchy
                 levels 2 and 3 (L2 and L3) to reduce memory access
                 time. A Gigabit Ethernet interface driven by direct
                 memory access (DMA) is integrated in the cache
                 hierarchy, requiring only an external physical link
                 layer chip to connect to the media. The integrated L3
                 cache stores a total of 4 MB of data, using multibank
                 embedded dynamic random access memory (DRAM). The
                 1,024-bit-wide data port of the embedded DRAM provides
                 22.4 GB/s bandwidth to serve the speculative
                 prefetching demands of the two processor cores and the
                 Gigabit Ethernet DMA engine. To reduce hardware
                 overhead due to cache coherence intervention requests,
                 memory coherence is maintained by software. This is
                 particularly efficient for regular highly parallel
                 applications with partitionable working sets. The
                 system further integrates an on-chip double-data-rate
                 (DDR) DRAM controller for direct attachment of main
                 memory modules to optimize overall memory performance
                 and cost. For booting the system and low-latency
                 interprocessor communication and synchronization, a
                 16-KB static random access memory (SRAM) and hardware
                 locks have been added to the design.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Adiga:2005:BGT,
  author =       "N. R. Adiga and M. A. Blumrich and D. Chen and P.
                 Coteus and A. Gara and M. E. Giampapa and P.
                 Heidelberger and S. Singh and B. D. Steinmacher-Burow
                 and T. Takken and M. Tsao and P. Vranas",
  title =        "{Blue Gene/L} torus interconnection network",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "265--276",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/adiga.pdf",
  abstract =     "The main interconnect of the massively parallel Blue
                 Gene/L is a three-dimensional torus network with
                 dynamic virtual cut-through routing. This paper
                 describes both the architecture and the
                 microarchitecture of the torus and a network
                 performance simulator. Both simulation results and
                 hardware measurements are presented.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Bright:2005:BGC,
  author =       "A. A. Bright and R. A. Haring and M. B. Dombrowa and
                 M. Ohmacht and D. Hoenicke and S. Singh and J. A.
                 Marcella and R. F. Lembach and S. M. Douskey and M. R.
                 Ellavsky and C. G. Zoellin and A. Gara",
  title =        "{Blue Gene/L} compute chip: Synthesis, timing, and
                 physical design",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "277--287",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/bright.pdf",
  abstract =     "As one of the most highly integrated system-on-a-chip
                 application-specific integrated circuits (ASICs) to
                 date, the Blue Gene/L compute chip presented unique
                 challenges that required extensions of the standard
                 ASIC synthesis, timing, and physical design
                 methodologies. We describe the design flow from
                 floorplanning through synthesis and timing closure to
                 physical design, with emphasis on the novel features of
                 this ASIC. Among these are a process to easily inject
                 datapath placements for speed-critical circuits or to
                 relieve wire congestion, and a timing closure
                 methodology that resulted in timing closure for both
                 nominal and worst-case timing specifications. The
                 physical design methodology featured removal of the
                 pre-physical-design buffering to improve routability
                 and visualization of buses, and it featured strategic
                 seeding of buffers to close wiring and timing and end
                 up at 90\% utilization of total chip area. Robustness
                 was enhanced by using additional input/output (I/O) and
                 internal decoupling capacitors and by increasing
                 I/O-to-C4 wire widths.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Haring:2005:BGC,
  author =       "R. A. Haring and R. Bellofatto and A. A. Bright and P.
                 G. Crumley and M. B. Dombrowa and S. M. Douskey and M.
                 R. Ellavsky and B. Gopalsamy and D. Hoenicke and T. A.
                 Liebsch and J. A. Marcella and M. Ohmacht",
  title =        "{Blue Gene/L} compute chip: Control, test, and
                 bring-up infrastructure",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "289--301",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/haring.pdf",
  abstract =     "The Blue Gene/L compute (BLC) and Blue Gene/L link
                 (BLL) chips have extensive facilities for control,
                 bring-up, self-test, debug, and nonintrusive
                 performance monitoring built on a serial interface
                 compliant with IEEE Standard 1149.1. Both the BLL and
                 the BLC chips contain a standard eServer chip JTAG
                 controller called the access macro. For BLC, the
                 capabilities of the access macro were extended (1) to
                 accommodate the secondary JTAG controllers built into
                 embedded PowerPC cores; (2) to provide direct access to
                 memory for initial boot code load and for messaging
                 between the service node and the BLC chip; (3) to
                 provide nonintrusive access to device control
                 registers; and (4) to provide a suite of chip
                 configuration and control registers. The BLC clock tree
                 structure is described. It accommodates both functional
                 requirements and requirements for enabling multiple
                 built-in self-test domains, differentiated both by
                 frequency and functionality. The chip features a debug
                 port that allows observation of critical chip signals
                 at full speed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Wazlowski:2005:VSB,
  author =       "M. E. Wazlowski and N. R. Adiga and D. K. Beece and R.
                 Bellofatto and M. A. Blumrich and D. Chen and M. B.
                 Dombrowa and A. Gara and M. E. Giampapa and R. A.
                 Haring and P. Heidelberger and D. Hoenicke and B. J.
                 Nathanson and M. Ohmacht and R. Sharrar and S. Singh
                 and B. D. Steinmacher-Burow and R. B. Tremaine and M.
                 Tsao and A. R. Umamaheshwaran and P. Vranas",
  title =        "Verification strategy for the {Blue Gene/L} chip",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "303--318",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/wazlowski.pdf",
  abstract =     "The Blue Gene/L compute chip contains two PowerPC 440
                 processor cores, private L2 prefetch caches, a shared
                 L3 cache and double-data-rate synchronous dynamic
                 random access memory (DDR SDRAM) memory controller, a
                 collective network interface, a torus network
                 interface, a physical network interface, an interrupt
                 controller, and a bridge interface to slower devices.
                 System-on-a-chip verification problems require a
                 multilevel verification strategy in which the strengths
                 of each layer offset the weaknesses of another layer.
                 The verification strategy we adopted relies on the
                 combined strengths of random simulation, directed
                 simulation, and code-driven simulation at the unit and
                 system levels. The strengths and weaknesses of the
                 various techniques and our reasons for choosing them
                 are discussed. The verification platform is based on
                 event simulation and cycle simulation running on a farm
                 of Intel-processor-based machines, several
                 PowerPC-processor-based machines, and the internally
                 developed hardware accelerator Awan. The
                 cost/performance tradeoffs of the different platforms
                 are analyzed. The success of the first Blue Gene/L
                 nodes, which worked within days of receiving them and
                 had only a small number of undetected bugs (none
                 fatal), reflects both careful design and a
                 comprehensive verification strategy.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Giampapa:2005:BGA,
  author =       "M. E. Giampapa and R. Bellofatto and M. A. Blumrich
                 and D. Chen and M. B. Dombrowa and A. Gara and R. A.
                 Haring and P. Heidelberger and D. Hoenicke and G. V.
                 Kopcsay and B. J. Nathanson and B. D. Steinmacher-Burow
                 and M. Ohmacht and V. Salapura and P. Vranas",
  title =        "{Blue Gene/L} advanced diagnostics environment",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/",
  pages =        "319--331",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/giampapa.pdf",
  abstract =     "This paper describes the Blue Gene/L advanced
                 diagnostics environment (ADE) used throughout all
                 aspects of the Blue Gene/L project, including design,
                 logic verification, bringup, diagnostics, and
                 manufacturing test. The Blue Gene/L ADE consists of a
                 lightweight multithreaded coherence-managed kernel,
                 runtime libraries, device drivers, system programming
                 interfaces, compilers, and host-based development
                 tools. It provides complete and flexible access to all
                 features of the Blue Gene/L hardware. Prior to the
                 existence of hardware, ADE was used on Very high-speed
                 integrated circuit Hardware Description Language (VHDL)
                 models, not only for logic verification, but also for
                 performance measurements, code-path analysis, and
                 evaluation of architectural tradeoffs. During early
                 hardware bring-up, the ability to run in a
                 cycle-reproducible manner on both hardware and VHDL
                 proved invaluable in fault isolation and analysis.
                 However, ADE is also capable of supporting
                 high-performance applications and parallel test cases,
                 thereby permitting us to stress the hardware to the
                 limits of its capabilities. This paper also provides
                 insights into system-level and device-level programming
                 of Blue Gene/L to assist developers of high-performance
                 applications to more fully exploit the performance of
                 the machine.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Iyer:2005:EDT,
  author =       "S. S. Iyer and J. E. {Barth, Jr.} and P. C. Parries
                 and J. P. Norum and J. P. Rice and L. R. Logan and D.
                 Hoyniak",
  title =        "Embedded {DRAM}: Technology platform for the {Blue
                 Gene/L} chip",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "333--350",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/iyer.pdf",
  abstract =     "The Blue Gene/L chip is a technological tour de force
                 that embodies the system-on-a-chip concept in its
                 entirety. This paper outlines the salient features of
                 this 130-nm complementary metal oxide semiconductor
                 (CMOS) technology, including the IBM unique embedded
                 dynamic random access memory (DRAM) technology. Crucial
                 to the execution of Blue Gene/L is the simultaneous
                 instantiation of multiple PowerPC cores,
                 high-performance static random access memory (SRAM),
                 DRAM, and several other logic design blocks on a
                 single-platform technology. The IBM embedded DRAM
                 platform allows this seamless integration without
                 compromising performance, reliability, or yield. We
                 discuss the process architecture, the key parameters of
                 the logic components used in the processor cores and
                 other logic design blocks, the SRAM features used in
                 the L2 cache, and the embedded DRAM that forms the L3
                 cache. We also discuss the evolution of embedded DRAM
                 technology into a higher-performance space in the 90-nm
                 and 65-nm nodes and the potential for dynamic memory to
                 improve overall memory subsystem performance.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Boyle:2005:OQQ,
  author =       "P. A. Boyle and D. Chen and N. H. Christ and M. A.
                 Clark and S. D. Cohen and C. Cristian and Z. Dong and
                 A. Gara and B. Jo{\'o} and C. Jung and C. Kim and L. A.
                 Levkova and X. Liao and R. D. Mawhinney and S. Ohta and
                 K. Petrov and T. Wettig and A. Yamaguchi",
  title =        "Overview of the {QCDSP} and {QCDOC} computers",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "351--365",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/boyle.pdf",
  abstract =     "The QCDSP and QCDOC computers are two generations of
                 multi-thousand-node multidimensional mesh-based
                 computers designed to study quantum chromodynamics
                 (QCD), the theory of the strong nuclear force. QCDSP
                 (QCD on digital signal processors), a four-dimensional
                 mesh machine, was completed in 1998; in that year, it
                 won the Gordon Bell Prize in the price/performance
                 category. Two large installations---of 8,192 and 12,288
                 nodes, with a combined peak speed of one
                 teraflops---have been in operation since. QCD-on-a-chip
                 (QCDOC) utilizes a six-dimensional mesh and compute
                 nodes fabricated with IBM system-on-a-chip technology.
                 It offers a tenfold improvement in price/performance.
                 Currently, 100-node versions are operating, and there
                 are plans to build three 12,288-node, 10-teraflops
                 machines. In this paper, we describe the architecture
                 of both the QCDSP and QCDOC machines, the operating
                 systems employed, the user software environment, and
                 the performance of our application---lattice QCD.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Moreira:2005:BGP,
  author =       "J. E. Moreira and G. Alm{\'a}si and C. Archer and R.
                 Bellofatto and P. Bergner and J. R. Brunheroto and M.
                 Brutman and J. G. Casta{\~n}os and P. G. Crumley and M.
                 Gupta and T. Inglett and D. Lieber and D. Limpert and
                 P. McCarthy and M. Megerian and M. Mendell and M. Mundy
                 and D. Reed and R. K. Sahoo and A. Sanomiya and R. Shok
                 and B. Smith and G. G. Stewart",
  title =        "{Blue Gene/L} programming and operating environment",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "367--376",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/moreira.pdf",
  abstract =     "With up to 65,536 compute nodes and a peak performance
                 of more than 360 teraflops, the Blue Gene/L (BG/L)
                 supercomputer represents a new level of massively
                 parallel systems. The system software stack for BG/L
                 creates a programming and operating environment that
                 harnesses the raw power of this architecture with great
                 effectiveness. The design and implementation of this
                 environment followed three major principles:
                 simplicity, performance, and familiarity. By
                 specializing the services provided by each component of
                 the system architecture, we were able to keep each one
                 simple and leverage the BG/L hardware features to
                 deliver high performance to applications. We also
                 implemented standard programming interfaces and
                 programming languages that greatly simplified the job
                 of porting applications to BG/L. The effectiveness of
                 our approach has been demonstrated by the operational
                 success of several prototype and production machines,
                 which have already been scaled to 16,384 nodes.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Chatterjee:2005:DEH,
  author =       "S. Chatterjee and L. R. Bachega and P. Bergner and K.
                 A. Dockser and J. A. Gunnels and M. Gupta and F. G.
                 Gustavson and C. A. Lapkowski and G. K. Liu and M.
                 Mendell and R. Nair and C. D. Wait and T. J. C. Ward
                 and P. Wu",
  title =        "Design and exploitation of a high-performance {SIMD}
                 floating-point unit for {Blue Gene/L}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "377--391",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/chatterjee.pdf",
  abstract =     "We describe the design of a dual-issue
                 single-instruction, multiple-data-like (SIMD-like)
                 extension of the IBM PowerPC 440 floating-point unit
                 (FPU) core and the compiler and algorithmic techniques
                 to exploit it. This extended FPU is targeted at both
                 the IBM massively parallel Blue Gene/L machine and the
                 more pervasive embedded platforms. We discuss the
                 hardware and software codesign that was essential in
                 order to fully realize the performance benefits of the
                 FPU when constrained by the memory bandwidth
                 limitations and high penalties for misaligned data
                 access imposed by the memory hierarchy on a Blue Gene/L
                 node. Using both hand-optimized and compiled code for
                 key linear algebraic kernels, we validate the
                 architectural design choices, evaluate the success of
                 the compiler, and quantify the effectiveness of the
                 novel algorithm design techniques. Our measurements
                 show that the combination of algorithm, compiler, and
                 hardware delivers a significant fraction of peak
                 floating-point performance for compute-bound-kernels,
                 such as matrix multiplication, and delivers a
                 significant fraction of peak memory bandwidth for
                 memory-bound kernels, such as DAXPY, while remaining
                 largely insensitive to data alignment.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Almasi:2005:DIM,
  author =       "G. Alm{\'a}si and C. Archer and J. G. Casta{\~n}os and
                 J. A. Gunnels and C. C. Erway and P. Heidelberger and
                 X. Martorell and J. E. Moreira and K. Pinnow and J.
                 Ratterman and B. D. Steinmacher-Burow and W. Gropp and
                 B. Toonen",
  title =        "Design and implementation of message-passing services
                 for the {Blue Gene/L} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "393--406",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/almasi.pdf",
  abstract =     "The Blue Gene/L (BG/L) supercomputer, with 65,536
                 dual-processor compute nodes, was designed from the
                 ground up to support efficient execution of massively
                 parallel message-passing programs. Part of this support
                 is an optimized implementation of the Message Passing
                 Interface (MPI), which leverages the hardware features
                 of BG/L. MPI for BG/L is implemented on top of a more
                 basic message-passing infrastructure called the message
                 layer. This message layer can be used both to implement
                 other higher-level libraries and directly by
                 applications. MPI and the message layer are used in the
                 two BG/L modes of operation: the coprocessor mode and
                 the virtual node mode. Performance measurements show
                 that our message-passing services deliver performance
                 close to the hardware limits of the machine. They also
                 show that dedicating one of the processors of a node to
                 communication functions (coprocessor mode) greatly
                 improves the message-passing bandwidth, whereas running
                 two processes per compute node (virtual node mode) can
                 have a positive impact on application performance.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Martorell:2005:BGP,
  author =       "X. Martorell and N. Smeds and R. Walkup and J. R.
                 Brunheroto and G. Alm{\'a}si and J. A. Gunnels and L.
                 DeRose and J. Labarta and F. Escal{\'e} and J.
                 Gim{\'e}nez and H. Servat and J. E. Moreira",
  title =        "{Blue Gene/L} performance tools",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "407--424",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/martorell.pdf",
  abstract =     "Good performance monitoring is the basis of modern
                 performance analysis tools for application
                 optimization. We are providing a variety of such
                 performance analysis tools for the new Blue Gene/L
                 supercomputer. Those tools can be divided into two
                 categories: single-node performance tools and multinode
                 performance tools. From a single-node perspective, we
                 provide standard interfaces and libraries, such as PAPI
                 and libHPM, that provide access to the hardware
                 performance counters for applications running on the
                 Blue Gene/L compute nodes. From a multinode
                 perspective, we focus on tools that analyze Message
                 Passing Interface (MPI) behavior. Those tools work by
                 first collecting message-passing trace data when a
                 program runs. The trace data is then used by graphical
                 interface tools that analyze the behavior of
                 applications. Using the current prototype tools, we
                 demonstrate their usefulness and applicability with
                 case studies of application optimization.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Aridor:2005:RAU,
  author =       "Y. Aridor and T. Domany and O. Goldshmidt and J. E.
                 Moreira and E. Shmueli",
  title =        "Resource allocation and utilization in the {Blue
                 Gene/L} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "425--436",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/aridor.pdf",
  abstract =     "This paper describes partition allocation for parallel
                 jobs in the Blue Gene/L supercomputer. It describes the
                 novel network architecture of the Blue Gene/L (BG/L)
                 three-dimensional (3D) computational core and presents
                 a preliminary analysis of its properties and advantages
                 compared those of with more traditional systems. The
                 scalability challenge is solved in BG/L by sacrificing
                 granularity of system management. The system is treated
                 as a collection of composite allocation units that
                 contain both processing and communication resources. We
                 discuss the ensuing algorithmic framework for
                 computational and communication resource allocation and
                 present results of simulations that explore resource
                 utilization of BG/L for different workloads. We find
                 that utilization depends strongly on both the
                 predominant partition topology (mesh or torus) and the
                 3D shapes requested by the running jobs. When
                 communication links are treated as dedicated resources,
                 it is much more difficult to allocate toroidal
                 partitions than mesh ones, especially for jobs of more
                 than one allocation unit in each dimension. We show
                 that in these difficult cases, the advantage of BG/L
                 compared with a 3D toroidal machine of the same size is
                 very significant, with resource utilization better by a
                 factor of 2. In the easier cases (e.g., predominantly
                 mesh partitions), there are no disadvantages. The
                 advantage is primarily due to the BG/L novel
                 multi-toroidal topology that permits coallocation of
                 multiple toroidal partitions at negligible additional
                 cost.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Lorenz:2005:VTB,
  author =       "J. Lorenz and S. Kral and F. Franchetti and C. W.
                 Ueberhuber",
  title =        "Vectorization techniques for the {Blue Gene/L} double
                 {FPU}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "437--446",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/lorenz.pdf",
  abstract =     "This paper presents vectorization techniques tailored
                 to meet the specifics of the two-way single-instruction
                 multiple-data (SIMD) double-precision floating-point
                 unit (FPU), which is a core element of the node
                 application-specific integrated circuit (ASIC) chips of
                 the IBM 360-teraflops Blue Gene/L supercomputer. This
                 paper focuses on the general-purpose basic-block
                 vectorization and optimization methods as they are
                 incorporated in the Vienna MAP vectorizer and
                 optimizer. The innovative technologies presented here,
                 which have consistently delivered superior performance
                 and portability across a wide range of platforms, were
                 carried over to prototypes of Blue Gene/L and joined
                 with the automatic performance-tuning system known as
                 Fastest Fourier Transform in the West (FFTW). FFTW
                 performance-optimization facilities working with the
                 compiler technologies presented in this paper are able
                 to produce vectorized fast Fourier transform (FFT)
                 codes that are tuned automatically to single Blue
                 Gene/L processors and are up to 80\% faster than the
                 best-performing scalar FFT codes generated by FFTW.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Germain:2005:EPD,
  author =       "R. S. Germain and Y. Zhestkov and M. Eleftheriou and
                 A. Rayshubskiy and F. Suits and T. J. C. Ward and B. G.
                 Fitch",
  title =        "Early performance data on the {Blue Matter} molecular
                 simulation framework",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "447--455",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/germain.pdf",
  abstract =     "Blue Matter is the application framework being
                 developed in conjunction with the scientific portion of
                 the IBM Blue Gene project. We describe the parallel
                 decomposition currently being used to target the Blue
                 Gene/L machine and discuss the application-based trace
                 tools used to analyze the performance of the
                 application. We also present the results of early
                 performance studies, including a comparison of the
                 performance of the Ewald and the particle-particle
                 particle-mesh (P3ME) methods, compare the measured
                 performance of some key collective operations with the
                 limitations imposed by the hardware, and discuss some
                 future directions for research.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Eleftheriou:2005:SFF,
  author =       "M. Eleftheriou and B. G. Fitch and A. Rayshubskiy and
                 T. J. C. Ward and R. S. Germain",
  title =        "Scalable framework for {$3$D} {FFTs} on the {Blue
                 Gene/L} supercomputer: Implementation and early
                 performance measurements",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "457--464",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/eleftheriou.pdf",
  abstract =     "This paper presents results on a
                 communications-intensive kernel, the three-dimensional
                 fast Fourier transform (3D FFT), running on the
                 2,048-node Blue Gene/L (BG/L) prototype. Two
                 implementations of the volumetric FFT algorithm were
                 characterized, one built on the Message Passing
                 Interface library and another built on an active packet
                 Application Program Interface supported by the hardware
                 bring-up environment, the BG/L advanced diagnostics
                 environment. Preliminary performance experiments on the
                 BG/L prototype indicate that both of our
                 implementations scale well up to 1,024 nodes for $3$D
                 FFTs of size $128 \time 128 \times 128$. The
                 performance of the volumetric FFT is also compared with
                 that of the Fastest Fourier Transform in the West
                 (FFTW) library. In general, the volumetric FFT
                 outperforms a port of the FFTW Version 2.1.5 library on
                 large-node-count partitions.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Enenkel:2005:CMF,
  author =       "R. F. Enenkel and B. G. Fitch and R. S. Germain and F.
                 G. Gustavson and A. Martin and M. Mendell and J. W.
                 Pitera and M. C. Pitman and A. Rayshubskiy and F. Suits
                 and W. C. Swope and T. J. C. Ward",
  title =        "Custom math functions for molecular dynamics",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "465--474",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/enenkel.pdf",
  abstract =     "While developing the protein folding application for
                 the IBM Blue Gene/L supercomputer, some frequently
                 executed computational kernels were encountered. These
                 were significantly more complex than the linear algebra
                 kernels that are normally provided as tuned libraries
                 with modern machines. Using regular library functions
                 for these would have resulted in an application that
                 exploited only 5--10\% of the potential floating-point
                 throughput of the machine. This paper is a tour of the
                 functions encountered; they have been expressed in C++
                 (and could be expressed in other languages such as
                 Fortran or C). With the help of a good optimizing
                 compiler, floating-point efficiency is much closer to
                 100\%. The protein folding application was initially
                 run by the life science researchers on IBM POWER3e
                 machines while the computer science researchers were
                 designing and bringing up the Blue Gene/L hardware.
                 Some of the work discussed resulted in enhanced
                 compiler optimizations, which now improve the
                 performance of floating-point-intensive applications
                 compiled by the IBM VisualAgent series of compilers for
                 POWER3, POWER4e, POWER4+, and POWER5. The
                 implementations are offered in the hope that they may
                 help in other implementations of molecular dynamics or
                 in other fields of endeavor, and in the hope that
                 others may adapt the ideas presented here to deliver
                 additional mathematical functions at high throughput.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Suits:2005:OMD,
  author =       "F. Suits and M. C. Pitman and J. W. Pitera and W. C.
                 Swope and R. S. Germain",
  title =        "Overview of molecular dynamics techniques and early
                 scientific results from the {Blue Gene} project",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "475--487",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/suits.pdf",
  abstract =     "The Blue Gene project involves the development of a
                 highly parallel supercomputer, the coding of scalable
                 applications to run on it, and the design of protein
                 simulations that take advantage of the power provided
                 by the new machine. This paper provides an overview of
                 analysis techniques applied to scientific results
                 obtained with Blue Matter, the software framework for
                 performing molecular dynamics simulations on the Blue
                 Gene/L computer. Blue Matter is a portable environment
                 that runs on several platforms ranging from
                 single-processor to massively parallel machines. Since
                 the Blue Gene/L computer has become available only
                 recently, this work describes analysis techniques
                 applied to a range of experiments of increasing
                 complexity on a corresponding range of machine sizes,
                 concluding with a membrane protein simulation currently
                 running on a 512-node Blue Gene/L computer.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Bhanot:2005:OTL,
  author =       "G. Bhanot and A. Gara and P. Heidelberger and E.
                 Lawless and J. C. Sexton and R. Walkup",
  title =        "Optimizing task layout on the {Blue Gene/L}
                 supercomputer",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "2/3",
  pages =        "489--500",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 1 08:14:41 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/492/bhanot.pdf",
  abstract =     "A general method for optimizing problem layout on the
                 Blue Gene/L (BG/L) supercomputer is described. The
                 method takes as input the communication matrix of an
                 arbitrary problem as an array with entries $C(i, j)$,
                 which represents the data communicated from domain $i$
                 to domain $j$. Given $C(i, j)$, we implement a
                 heuristic map that attempts to sequentially map a
                 domain and its communication neighbors either to the
                 same BG/L node or to near-neighbor nodes on the BG/L
                 torus, while keeping the number of domains mapped to a
                 BG/L node constant. We then generate a Markov chain of
                 maps using Monte Carlo simulation with free energy $F =
                 \sum_{i,j} C(i, j)H(i, j)$, where $H(i, j)$ is the
                 smallest number of hops on the BG/L torus between
                 domain $i$ and domain $j$. For two large parallel
                 applications, SAGE and UMT2000, the method was tested
                 against the default Message Passing Interface rank
                 order layout on up to 2,048 BG/L nodes. It produced
                 maps that improved communication efficiency by up to
                 45\%.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0240",
}

@Article{Tendler:2005:P,
  author =       "Joel M. Tendler",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "503--504",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sinharoy:2005:PSM,
  author =       "B. Sinharoy and R. N. Kalla and J. M. Tendler and R.
                 J. Eickemeyer and J. B. Joyner",
  title =        "{POWER5} system microarchitecture",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "505--521",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/sinharoy.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Armstrong:2005:AVC,
  author =       "W. J. Armstrong and R. L. Arndt and D. C. Boutcher and
                 R. G. Kovacs and D. Larson and K. A. Lucke and N. Nayar
                 and R. C. Swanberg",
  title =        "Advanced virtualization capabilities of {POWER5}
                 systems",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "523--532",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/armstrong.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mackerras:2005:OSE,
  author =       "P. Mackerras and T. S. Mathews and R. C. Swanberg",
  title =        "Operating system exploitation of the {POWER5} system",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "533--539",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/mackerras.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Victor:2005:FVP,
  author =       "D. W. Victor and J. M. Ludden and R. D. Peterson and
                 B. S. Nelson and W. K. Sharp and J. K. Hsu and B.-L.
                 Chu and M. L. Behm and R. M. Gott and A. D. Romonosky
                 and S. R. Farago",
  title =        "Functional verification of the {POWER5} microprocessor
                 and {POWER5} multiprocessor systems",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "541--553",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/victor.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mathis:2005:CSM,
  author =       "H. M. Mathis and A. E. Mericas and J. D. McCalpin and
                 R. J. Eickemeyer and S. R. Kunkel",
  title =        "Characterization of simultaneous multithreading
                 ({SMT}) efficiency in {POWER5}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "555--564",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See erratum \cite{Anonymous:2005:ECS}.",
  URL =          "http://www.research.ibm.com/journal/rd/494/mathis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gott:2005:FFV,
  author =       "R. M. Gott and J. R. Baumgartner and P. Roessler and
                 S. I. Joe",
  title =        "Functional formal verification on designs of {pSeries}
                 microprocessors and communication subsystems",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "565--580",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/gott.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Goldman:2005:UMF,
  author =       "S. P. Goldman and L. M. Mohr and D. R. Smith",
  title =        "Using microcode in the functional verification of an
                 {I/O} chip",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "581--588",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/goldman.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kahle:2005:ICM,
  author =       "J. A. Kahle and M. N. Day and H. P. Hofstee and C. R.
                 Johns and T. R. Maeurer and D. Shippy",
  title =        "Introduction to the {Cell} multiprocessor",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "589--604",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/kahle.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Frase:2005:P,
  author =       "Katharine G. Frase and David E. Seeger",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "605--606",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/preface2.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kang:2005:MMP,
  author =       "S. K. Kang and P. A. Lauro and D.-Y. Shih and D. W.
                 Henderson and K. J. Puttlitz",
  title =        "Microstructure and mechanical properties of lead-free
                 solders and solder joints used in microelectronic
                 applications",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "607--620",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/kang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gruber:2005:LCW,
  author =       "P. A. Gruber and L. B{\'e}langer and G. P. Brouillette
                 and D. H. Danovitch and J.-L. Landreville and D. T.
                 Naugle and V. A. Oberson and D.-Y. Shih and C. L.
                 Tessler and M. R. Turgeon",
  title =        "Low-cost wafer bumping",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "621--639",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/gruber.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Blackshear:2005:EBP,
  author =       "E. D. Blackshear and M. Cases and E. Klink and S. R.
                 Engle and R. S. Malfatt and D. N. de Araujo and S.
                 Oggioni and L. D. Lacroix and J. A. Wakil and N. H.
                 Pham and G. G. Hougham and D. J. Russell",
  title =        "The evolution of build-up package technology and its
                 design challenges",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "641--661",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/blackshear.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buchwalter:2005:EMS,
  author =       "S. L. Buchwalter and P. J. Brofman and C. Feger and M.
                 A. Gaynes and K.-W. Lee and L. J. Matienzo and D. L.
                 Questad",
  title =        "Effects of mechanical stress and moisture on packaging
                 interfaces",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "663--675",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/buchwalter.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yarmchuk:2005:LDS,
  author =       "E. J. Yarmchuk and C. W. Cline and D. C. Bruen",
  title =        "Latent defect screening for high-reliability
                 glass-ceramic multichip module copper interconnects",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "677--685",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/yarmchuk.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Manzer:2005:HSE,
  author =       "D. G. Manzer and J. P. Karidis and K. M. Wiley and D.
                 C. Bruen and C. W. Cline and C. Hendricks and R. N.
                 Wiggin and Y.-Y. Yu",
  title =        "High-speed electrical testing of multichip ceramic
                 modules",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "687--697",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/manzer.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Feger:2005:MRS,
  author =       "C. Feger and J. D. Gelorme and M. McGlashan-Powell and
                 D. M. Kalyon",
  title =        "Mixing, rheology, and stability of highly filled
                 thermal pastes",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "699--707",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/feger.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schmidt:2005:CDC,
  author =       "R. R. Schmidt and E. E. Cruz and M. K. Iyengar",
  title =        "Challenges of data center thermal management",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "709--723",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/schmidt.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Knickerbocker:2005:DNG,
  author =       "J. U. Knickerbocker and P. S. Andry and L. P.
                 Buchwalter and A. Deutsch and R. R. Horton and K. A.
                 Jenkins and Y. H. Kwark and G. McVicker and C. S. Patel
                 and R. J. Polastre and C. Schuster and A. Sharma and S.
                 M. Sri-Jayantha and C. W. Surovic and C. K. Tsang and
                 B. C. Webb and S. L. Wright and S. R. McKnight and E.
                 J. Sprogis and B. Dang",
  title =        "Development of next-generation system-on-package
                 ({SOP}) technology based on silicon carriers with
                 fine-pitch chip interconnection",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "725--753",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/knickerbocker.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Benner:2005:EOI,
  author =       "A. F. Benner and M. Ignatowski and J. A. Kash and D.
                 M. Kuchta and M. B. Ritter",
  title =        "Exploitation of optical interconnects in future server
                 architectures",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "755--775",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/benner.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lanzerotti:2005:MPI,
  author =       "M. Y. Lanzerotti and G. Fiorenza and R. A. Rand",
  title =        "Microminiature packaging and integrated circuitry: The
                 work of {E. F. Rent}, with an application to on-chip
                 interconnection requirements",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "4/5",
  pages =        "777--803",
  month =        "????",
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 5 07:12:31 MDT 2005",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/494/lanzerotti.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bradicich:2005:P,
  author =       "T. M. Bradicich",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "807--??",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Desai:2005:BSO,
  author =       "D. M. Desai and T. M. Bradicich and D. Champion and W.
                 G. Holland and B. M. Kreuz",
  title =        "{BladeCenter} system overview",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "809--821",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/desai.html",
  abstract =     "The IBM eServer BladeCenter system was conceived in
                 the fall of 1999 by members of the IBM xSeries server
                 brand technical team (at the time, called the Netfinity
                 brand). It was a new idea, and for some, too
                 revolutionary to consider. After considerable end-user
                 feedback, technical refinement, and internal discussion
                 and debate, the concept was developed into a leadership
                 server product. This paper provides a brief historic
                 overview of the development of the architecture and
                 blade servers, and a technical description of the
                 BladeCenter system and technology.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Hughes:2005:BMM,
  author =       "J. E. Hughes and P. S. Patel and I. R. Zapata and T.
                 D. {Pahel, Jr.} and J. P. Wong and D. M. Desai and B.
                 D. Herrman",
  title =        "{BladeCenter} midplane and media interface card",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "823--836",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/patel.html",
  abstract =     "This paper describes the electrical architecture and
                 design of the IBM eServer BladeCenter midplane and
                 media interface card. The midplane provides the
                 redundant interconnects among processor blades, switch
                 modules, media interface card, and management modules.
                 It also serves as the redundant power distribution
                 medium from the power modules to all blades and other
                 devices. A major attribute of the BladeCenter
                 electrical design is the redundant nature of the
                 interconnects, which gives this product superior
                 reliability and availability. The media interface card
                 provides the interface between the CD-ROM and floppy
                 disk drives and the blades that share these devices.
                 The sharing of these devices was a key BladeCenter
                 innovation. Also, to ensure that the architecture will
                 be flexible enough to support multiple input/output
                 fabric protocols, SerDes (serialized/deserialized) is
                 used as the internal high-speed communication
                 electrical interface. Since high- speed designs can
                 easily result in higher implementation costs, a
                 significant predesign simulation effort was undertaken
                 to analyze and prioritize design guidelines in order to
                 develop a high-speed midplane at a competitive cost.
                 This paper highlights how we reduced board costs by
                 finding solutions that overcame some of the challenges
                 of 2.5-Gb/s data transmission over multiple printed
                 circuit boards and connectors.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Hughes:2005:BPB,
  author =       "J. E. Hughes and M. L. Scollard and R. Land and J.
                 Parsonese and C. C. West and V. A. Stankevich and C. L.
                 Purrington and D. Q. Hoang and G. R. Shippy and M. L.
                 Loeb and M. W. Williams and B. A. Smith and D. M.
                 Desai",
  title =        "{BladeCenter} processor blades, {I/O} expansion
                 adapters, and units",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "837--859",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/hughes.html",
  abstract =     "This paper describes the electrical architecture and
                 design of the IBM eServer BladeCenter processor blades,
                 expansion blades, and input/output (I/O) expansion
                 adapters and units. The processor blades are
                 independent, general-purpose servers containing
                 processors, chipsets, main memory, hard drives, network
                 interface controllers, power input control circuitry,
                 and local systems management. The blade architecture is
                 robust and flexible enough to enable the design of
                 general-purpose Intel- processor-based two-way and
                 four-way blades, IBM POWER-processor-based blades,
                 blades based on AMD Opteron processors, and common
                 expansion blades. In addition, the processor blades,
                 expansion adapters, and units use a serialized\slash
                 deserialized (SerDes) interface for the internal I/O
                 fabrics, thus giving blades the flexibility to support
                 virtually any I/O protocol that supports SerDes.
                 Support for I/O fabrics beyond the base Gigabit
                 Ethernet is accomplished via optional I/O expansion
                 adapters for Fibre Channel, Myricom Myrinet t,
                 InfiniBand t, or additional Gigabit Ethernet.
                 Additional storage or peripheral component interface
                 capability can be added to the processor blades via
                 expansion blades.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Fore:2005:BS,
  author =       "L. S. Fore and D. W. Cosby and G. Pruett and D. B.
                 Rhoades and C. O. Schulz and B. Smith and J. L.
                 Wooldridge",
  title =        "{BladeCenter} solutions",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "861--871",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/fore.html",
  abstract =     "The architecture and design of the IBM eServer
                 BladeCenter system make it an ideal platform for many
                 information technology (IT) solutions. Its high
                 availability, modularity, flexible infrastructure
                 integration, and on demand configuration options have
                 prompted developers within IBM and in end-user IT
                 organizations to create solutions tailored to a
                 particular industry or function. This paper describes
                 the BladeCenter system in the application of several of
                 these solutions--their target enterprises, end-users,
                 and key benefits. High-performance and scientific
                 clusters, branch-office-in-a-box, financial services,
                 and hosted- client solutions are reviewed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Vanderlinden:2005:BST,
  author =       "S. L. Vanderlinden and B. O. Anthony and G. D.
                 Batalden and B. K. Gorti and J. Lloyd and J. {Macon,
                 Jr.} and G. Pruett and B. A. Smith",
  title =        "{BladeCenter T} system for the telecommunications
                 industry",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "873--886",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/vanderlinden.html",
  abstract =     "This paper describes the IBM eServer BladeCenter T
                 system, an extension of the BladeCenter platform
                 designed for the specific and rigorous requirements of
                 the telecommunications industry, such as compliance
                 with Telcordia Technologies Network Equipment\slash
                 Building Standards (NEBSe) specifications. The
                 Telcordia NEBS documents and the analogous documents
                 written for the European marketplace by the European
                 Telecommunications Standards Institute define the range
                 of environmental and electrical parameters presented by
                 this market segment. A key characteristic of the
                 telecommunications industry is its focus on the
                 availability and redundancy of the equipment used to
                 provide service to its customers. These requirements
                 imposed significant design changes on the BladeCenter
                 platform and software, while maintaining a solution
                 compatible with the original BladeCenter architecture.
                 This paper provides details of the design changes that
                 were made in the areas of hardware, software, systems
                 management, and integration, and concludes with
                 examples and a discussion of customer solutions with
                 the BladeCenter T system.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Crippen:2005:BPP,
  author =       "M. J. Crippen and R. K. Alo and D. Champion and R. M.
                 Clemo and C. M. Grosser and N. J. Gruendler and M. S.
                 Mansuria and J. A. Matteson and M. S. Miller and B. A.
                 Trumbo",
  title =        "{BladeCenter} packaging, power, and cooling",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "887--904",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/crippen.html",
  abstract =     "This paper addresses the packaging, power, and cooling
                 of the IBM eServer BladeCenter compact server
                 infrastructure consisting of 14 servers in a 7U
                 (1U\slash 44.45 mm) vertical space for installation in
                 an industry-standard rack. A typical rack is 42U tall.
                 Therefore, six BladeCenter systems will fit in a rack,
                 for a total of 84 servers. The density of a {BladeCenter}
                 system (servers/ U) is double that of previous 1U
                 rack-optimized servers. To build such a dense server
                 system required overcoming a multitude of challenges in
                 packaging, power, and cooling design. Our approach to
                 these challenges is described, but in the broader
                 context of not only increasing the density, but setting
                 a new server standard for a highly available redundant
                 infrastructure with integrated systems management and
                 network switching that uses less power and is simple to
                 maintain on site or remotely, even by nonspecialized
                 personnel. Server processors, memory, storage, and
                 input/output devices were combined in a single compact
                 server unit called a processor blade, while the support
                 infrastructure, such as systems management, network
                 connectivity, optical media, power, and cooling, was
                 consolidated in a single structure and shared among
                 many servers. The result is a package architecture that
                 lends itself well to standardization. Custom server
                 blades and input/output devices may be designed in
                 accordance with BladeCenter base specifications and be
                 effectively integrated into the blade server system.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Hunter:2005:BN,
  author =       "S. W. Hunter and N. C. Strole and D. W. Cosby and D.
                 M. Green",
  title =        "{BladeCenter} networking",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "905--919",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/hunter.html",
  abstract =     "The IBM eServer BladeCenter system physically
                 consolidates the server and network into a common
                 chassis. It was introduced as a new server architecture
                 that provides many benefits over the traditional data
                 center model of clustered independent systems linked by
                 a network fabric. This paper describes the BladeCenter
                 networking architecture and relates it to user
                 requirements for multi-tier servers, scale-out models,
                 networking technology advances, and industry trends.
                 Design decisions and challenges, the switch subsystem
                 and input/output technology options, services that are
                 currently supported by the architecture, and future
                 enhancements and extensions are addressed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Holland:2005:BS,
  author =       "W. G. Holland and P. L. Caporale and D. S. Keener and
                 A. B. McNeill and T. B. Vojnovich",
  title =        "{BladeCenter} storage",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "921--939",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/holland.html",
  abstract =     "This paper describes the available storage options for
                 the IBM eServer BladeCenter system---local hard disk
                 drives on each processor blade, network-attached
                 storage accessed over Ethernet, and storage area
                 network (SAN)-attached storage accessed over Fibre
                 Channel---highlighting where each provides a compelling
                 or unique storage solution. The basic selection
                 criteria are presented, focusing on the most
                 significant attributes of each option. Additional
                 information is provided for emerging technologies,
                 iSCSI (SAN-attached storage accessed over Ethernet) and
                 InfiniBand, and the technologies and attributes that
                 have unique importance in a blade-server environment.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Brey:2005:BCM,
  author =       "T. Brey and B. E. Bigelow and J. E. Bolan and H.
                 Cheselka and Z. Dayar and J. M. Franke and D. E.
                 Johnson and R. N. Kantesaria and E. J. Klodnicki and S.
                 Kochar and S. M. Lardinois and C. A. Morrell and M. S.
                 Rollins and R. R. Wolford and D. R. Woodham",
  title =        "{BladeCenter} chassis management",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "941--961",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/brey.html",
  abstract =     "The IBM eServer BladeCenter system allows compute,
                 network, and storage components to operate under a
                 common chassis management scheme. It offers a new
                 approach to solving many systems management issues
                 surrounding the integration of power, packaging,
                 cooling, media peripherals, and cabling of multiple
                 compute servers, network switches, and storage into one
                 highly redundant package. In the BladeCenter design,
                 these functions are integrated into the chassis,
                 allowing the costs of each shared component to be
                 amortized across the entire chassis. At the heart of
                 the system is the management module hardware and
                 firmware that provides chassis management for all
                 components, thereby removing the cost and complexity of
                 having to manage each component independently.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Pruett:2005:BSM,
  author =       "G. Pruett and A. Abbondanzio and J. Bielski and T. D.
                 Fadale and A. E. Merkin and Z. Rafalovich and L. A.
                 Riedle and J. W. Simpson",
  title =        "{BladeCenter} systems management software",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "963--975",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/pruett.html",
  abstract =     "The management software for the IBM eServer
                 BladeCenter platform combines multiple management tools
                 and technologies to create an integrated solution for
                 managing, configuring, and deploying the chassis
                 components and attached storage area networks. The IBM
                 software also integrates BladeCenter platform
                 management capabilities with other enterprise system
                 management tools. This paper describes the architecture
                 and capabilities of the IBM Director, Cluster Systems
                 Manager, and Virtualization Enginee tools, which enable
                 customers to configure, manage, and provision the
                 BladeCenter system. These tools configure and monitor
                 the chassis using out-of-band communications with the
                 BladeCenter management module. Management agents
                 installed on each processor blade provide in-band
                 operating system monitoring and integration into
                 enterprise management applications, such as IBM Tivoli
                 software. This paper includes a description of the
                 management technologies and design innovations that
                 assist the system administrator with management tasks
                 such as discovery, blade and switch module
                 configuration, asset inventory, out-of- band control,
                 alerting and event actions, storage configuration,
                 operating system installation, application deployment,
                 and provisioning.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Piazza:2005:BTD,
  author =       "W. J. Piazza and R. E. Harper and M. J. Crippen and J.
                 A. Matteson",
  title =        "{BladeCenter} thermal diagnostics",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "977--987",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/piazza.html",
  abstract =     "An analytical technique called thermal diagnostics is
                 presented as a tool for determining the root cause of
                 thermal anomalies arising in electronic equipment. The
                 technique utilizes a dynamically constructed flow
                 network model, real-time inventory, temperature,
                 utilization metrics, and statistical hypothesis testing
                 to select the most likely scenario from among thousands
                 of potential causes of thermal problems. This paper
                 describes the concept of thermal diagnostics and
                 concludes with results from a laboratory evaluation in
                 which we physically trigger thermal anomalies on a
                 running IBM eServer BladeCenter system and record the
                 diagnosis given by the algorithm. In these tests, our
                 algorithm correctly diagnosed the thermal situation and
                 provided meaningful guidance toward clearing the
                 detected problems.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Anonymous:2005:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 49",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "989--998",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/authv49.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Anonymous:2005:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 49",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "999--1003",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/subjv49.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Anonymous:2005:ECS,
  author =       "Anonymous",
  title =        "Errata: {{\em Characterization of Simultaneous
                 Multithreading (SMT) Efficiency in POWER5}}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "1003--1003",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Mathis:2005:CSM}.",
  URL =          "http://www.research.ibm.com/journal/rd/496/errata.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Balog:2005:MVP,
  author =       "Douglas Balog",
  title =        "Message from the {Vice President, BladeCenter
                 Development, IBM Systems and Technology Group}",
  journal =      j-IBM-JRD,
  volume =       "49",
  number =       "6",
  pages =        "??--??",
  month =        nov,
  year =         "2005",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 21:39:23 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/496/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0245-00",
}

@Article{Gallagher:2006:P,
  author =       "W. J. Gallagher and S. S. P. Parkins",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "3--4",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Gallagher:2006:DMT,
  author =       "W. J. Gallagher and S. S. P. Parkin",
  title =        "Development of the magnetic tunnel junction {MRAM} at
                 {IBM}: From first junctions to a {16-Mb MRAM}
                 demonstrator chip",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "5--24",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See erratum \cite{Anonymous:2006:EDM}.",
  URL =          "http://www.research.ibm.com/journal/rd/501/gallagher.html",
  abstract =     "This paper reviews the remarkable developments of the
                 magnetic tunnel junction over the last decade and in
                 particular, work aimed at demonstrating its potential
                 for a dense, fast, and nonvolatile random access
                 memory. The initial focus is on the technological roots
                 of the magnetic tunnel junction, and then on the recent
                 progress made with engineered materials for this
                 device. Following that, we discuss the development of
                 the magnetic random access memory (MRAM) technology, in
                 which the magnetic tunnel junction serves as both the
                 storage device and the storage sensing device. The
                 emphasis is on work at IBM, including demonstrations of
                 basic capabilities of the technology and work on a
                 16-Mb ``product demonstrator'' design in 180-nm node
                 technology, which was targeted to be a realistic test
                 bed for the MRAM technology. Performance and cost are
                 compared with those of competing technologies. The
                 paper also serves as an introduction to more
                 specialized papers in this issue on MRAM device
                 physics, magnetic tunnel junction materials and device
                 characterization, MRAM processing, and MRAM design.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Maffitt:2006:DCM,
  author =       "T. M. Maffitt and J. K. DeBrosse and J. A. Gabric and
                 E. T. Gow and M. C. Lamorey and J. S. Parenteau and D.
                 R. Willmott and M. A. Wood and W. J. Gallagher",
  title =        "Design considerations for {MRAM}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "25--39",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/maffitt.html",
  abstract =     "MRAM (magnetic random access memory) technology, based
                 on the use of magnetic tunnel junctions (MTJs) as
                 memory elements, is a potentially fast nonvolatile
                 memory technology with very high write endurance. This
                 paper is an overview of MRAM design considerations.
                 Topics covered include MRAM fundamentals, array
                 architecture, several associated design studies, and
                 scaling challenges. In addition, a 16-Mb MRAM
                 demonstration vehicle is described, and performance
                 results are presented.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Gaidis:2006:TLB,
  author =       "M. C. Gaidis and E. J. O'Sullivan and J. J. Nowak and
                 Y. Lu and S. Kanakasabapathy and P. L. Trouilloud and
                 D. C. Worledge and S. Assefa and K. R. Milkove and G.
                 P. Wright and W. J. Gallagher",
  title =        "Two-level {BEOL} processing for rapid iteration in
                 {MRAM} development",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "41--54",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/gaidis.html",
  abstract =     "The implementation of magnetic random access memory
                 (MRAM) hinges on complex magnetic film stacks and
                 several critical steps in back-end-of-line (BEOL)
                 processing. Although intended for use in conjunction
                 with silicon CMOS front-end device drivers, MRAM
                 performance is not limited by CMOS technology. We
                 report here on a novel test site design and an
                 associated thin-film process integration scheme which
                 permit relatively inexpensive, rapid characterization
                 of the critical elements in MRAM device fabrication.
                 The test site design incorporates circuitry consistent
                 with the use of a large-area planar base electrode to
                 enable a processing scheme with only two photomask
                 levels. The thin-film process integration scheme is a
                 modification of standard BEOL processing to accommodate
                 temperature-sensitive magnetic tunnel junctions (MTJs)
                 and poor-shear-strength magnetic film interfaces.
                 Completed test site wafers are testable with high-speed
                 probing techniques, permitting characterization of
                 large numbers of MTJs for statistically significant
                 analyses. The approach described in this paper provides
                 an inexpensive means for rapidly iterating on MRAM
                 development alternatives to converage on an
                 implementation suitable for a production environment.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Abraham:2006:RTC,
  author =       "D. W. Abraham and P. L. Trouilloud and D. C.
                 Worledge",
  title =        "Rapid-turnaround characterization methods for {MRAM}
                 development",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "55--67",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/abraham.html",
  abstract =     "Magnetic random access memory (MRAM) technology, based
                 on the use of magnetic tunnel junctions (MTJs), holds
                 the promise of improving on the capabilities of
                 existing charge-based memories by offering the
                 combination of nonvolatility, speed, and density in a
                 single technology. In this paper we review
                 rapid-turnaround methods which have been developed or
                 applied in new ways to characterize MRAM chips at
                 various stages during processing, with particular
                 emphasis on the MTJs. The methods include
                 current-in-plane tunneling (CIPT), Kerr magnetometry,
                 vibrating sample magnetometry (VSM), and conducting
                 atomic force microscopy (CAFM). Use of the methods has
                 enabled rapid learning with respect to the materials
                 used for the MTJs, as well as tuning of the MTJ
                 geometry in terms of size and shape and of the
                 patterning methods employed. Examples of the use of
                 each of the methods are presented along with
                 interpretation of the data via critical operating
                 parameters.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Worledge:2006:SDM,
  author =       "D. C. Worledge",
  title =        "Single-domain model for toggle {MRAM}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "69--79",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/worledge.html",
  abstract =     "An overview is presented of the use of a single-domain
                 model for developing an understanding of the switching
                 of two coupled magnetic free layers for toggle MRAM
                 (magnetic random access memory). The model includes the
                 effects of length, width, thickness, magnetization,
                 thickness asymmetry, intrinsic anisotropy, exchange
                 coupling, dipole coupling, and applied magnetic field.
                 First, a simple perturbative approach is used to
                 understand the basic phenomena at low fields, including
                 the critical switching curve and activation energy.
                 Then the more general model is applied in order to
                 understand the effects of saturation at large field,
                 and thickness asymmetry. The major results are that
                 toggle MRAM should have a larger margin for half-select
                 and full- select switching fields than Stoner\slash
                 Wohlfarth MRAM, and that the activation energy should
                 increase upon half-select, thus eliminating the
                 half-select activated-error problem.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Sun:2006:SAM,
  author =       "J. Z. Sun",
  title =        "Spin angular momentum transfer in
                 current-perpendicular nanomagnetic junctions",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "81--100",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/sun.html",
  abstract =     "Spin angular momentum transfer, or spin-transfer,
                 describes the transfer of spin angular momentum between
                 a spin-polarized current and a ferromagnetic conductor.
                 The angular momentum transfer exerts a torque
                 (spin-current induced torque, or spin- torque) on the
                 ferromagnetic conductor. When its dimensions are
                 reduced to less than 100 nm, the spin-torque can become
                 comparable to the magnetic damping torque at a
                 spin-polarized current of high current density (above
                 106 A/cm2), giving rise to a new set of current-induced
                 dynamic excitation and magnetic switching phenomena.
                 This has now been definitively observed in sub-100-nm
                 current-perpendicular spin-valves and magnetic tunnel
                 junctions, and appears promising as a basis for direct
                 write-address of a nanomagnetic bit when the lateral
                 bit size is reduced to well below 100 nm. An overview
                 is presented in this paper of spin- transfer phenomena.
                 The first part of the paper contains a brief
                 introduction to spin-transfer, especially the
                 characteristic dynamics associated with spin-torque. In
                 the second part, several representative experiments are
                 described. In the third part, a set of basic
                 phenomenological models are introduced that describe
                 experimental observations. The models also serve as a
                 bridge for quantitative comparison between experiments
                 and first-principles spin-polarized transport theory.
                 In the last part of the paper, some device concepts
                 based on spin-transfer-induced magnetic excitation and
                 magnetic reversal are described.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Wolf:2006:SRP,
  author =       "S. A. Wolf and A. Y. Chtchelkanova and D. M. Treger",
  title =        "Spintronics---{A} retrospective and perspective",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "101--110",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/wolf.html",
  abstract =     "Spintronics is a rapidly emerging field of science and
                 technology that will most likely have a significant
                 impact on the future of all aspects of electronics as
                 we continue to move into the 21st century. Conventional
                 electronics are based on the charge of the electron.
                 Attempts to use the other fundamental property of an
                 electron, its spin, have given rise to a new, rapidly
                 evolving field, known as spintronics, an acronym for
                 spin transport electronics that was first introduced in
                 1996 to designate a program of the U.S. Defense
                 Advanced Research Projects Agency (DARPA). Initially,
                 the spintronics program involved overseeing the
                 development of advanced magnetic memory and sensors
                 based on spin transport electronics. It was then
                 expanded to included Spins IN Semiconductors (SPINS),
                 in the hope of developing a new paradigm in
                 semiconductor electronics based on the spin degree of
                 freedom of the electron. Studies of spin-polarized
                 transport in bulk and low-dimensional semiconductor
                 structures show promise for the creation of a hybrid
                 device that would combine magnetic storage with
                 gain--in effect, a spin memory transistor. This paper
                 reviews some of the major developments in this field
                 and provides a perspective of what we think will be the
                 future of this exciting field. It is not meant to be a
                 comprehensive review of the whole field but reflects a
                 bias on the part of the authors toward areas that they
                 believe will lead to significant future technologies.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Jiang:2006:HER,
  author =       "X. Jiang and R. Wang and R. M. Shelby and S. S. P.
                 Parkin",
  title =        "Highly efficient room-temperature tunnel spin injector
                 using {CoFe\slash MgO(001)}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "111--120",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/jiang.html",
  abstract =     "Semiconductor spintronics is a promising technology in
                 which the spin states of electrons are utilized as an
                 additional degree of freedom for device operation. One
                 of its prerequisites is the ability to inject
                 spin-polarized electrons into semiconductors. An
                 overview is presented of recent progress in spin
                 injection using an injector based on a crystalline
                 CoFe/MgO(001) tunnel structure. The spin polarization
                 of the electrons that were injected into a GaAs
                 quantum-well light-emitting diode was inferred from
                 electroluminescence polarization from the quantum well.
                 Spin polarizations of 57\% at 100 K and 47\% at room
                 temperature were obtained. The spin polarization was
                 found to exhibit a strong dependence on bias and
                 temperature, which can be explained on the basis of
                 spin relaxation within the GaAs.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Zutic:2006:BSF,
  author =       "I. {\v{Z}}uti{\'c} and J. Fabian and S. C. Erwin",
  title =        "Bipolar spintronics: Fundamentals and applications",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "121--139",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/zutic.html",
  abstract =     "By incorporating spin-dependent properties and
                 magnetism in semiconductor structures, new applications
                 can be considered which go beyond magnetoresistive
                 effects in metallic systems. Notwithstanding the
                 prospects for spin/magnetism-enhanced logic in
                 semiconductors, many important theoretical,
                 experimental, and materials challenges remain. Here we
                 discuss the challenges for realizing a particular class
                 of associated applications and our proposal for bipolar
                 spintronic devices in which carriers of both polarities
                 (electrons and holes) would contribute to spin-charge
                 coupling. We formulate the theoretical framework for
                 bipolar spin- polarized transport and describe several
                 novel effects in two- and three-terminal structures
                 which arise from the interplay between nonequilibrium
                 spin and equilibrium magnetization.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Bernevig:2006:TDS,
  author =       "B. A. Bernevig and S. Zhang",
  title =        "Toward dissipationless spin transport in
                 semiconductors",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "141--148",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/bernevig.html",
  abstract =     "Spin-based electronics promises a radical alternative
                 to charge- based electronics, namely the possibility of
                 logic operations with much lower power consumption than
                 equivalent charge-based logic operations. In this paper
                 we review three potential means of dissipationless spin
                 transport in semiconductors with and without spin-orbit
                 coupling: the use of spin currents, propagating modes,
                 and orbital currents. Spin and orbital currents induced
                 by electric fields obey a fundamentally different law
                 than charge transport, which is dissipative.
                 Dissipationless spin currents occur in materials with
                 strong spin-orbit coupling, such as GaAs, while orbital
                 currents occur in materials with weak spin-orbit
                 coupling, such as Si, but with degenerate bands
                 characterized by an atomic orbital index. Spin currents
                 have recently been observed experimentally. Propagating
                 modes are the coupled spin-charge movement that occurs
                 in semiconductors with spin-orbit coupling. In contrast
                 to normal charge transport, which is diffusive, the
                 spin-charge mode can exhibit propagating transport,
                 with low energy loss over relatively large distances
                 (.100 lm), by funneling energy between the spin and the
                 charge component through the spin-orbit coupling
                 channel. This opens the possibility for spin-based
                 transport without either spin injection or spin
                 detection. The schemes discussed in this paper are
                 analyzed in comparison with schemes based on molecular
                 electronics phenomena, dilute magnetic semiconductors,
                 etc.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Agarwal:2006:AGA,
  author =       "R. C. Agarwal and K. Gupta and S. Jain and S.
                 Amalapurapu",
  title =        "An approximation to the greedy algorithm for
                 differential compression",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "1",
  pages =        "149--166",
  month =        jan,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/501/agarwal.html",
  abstract =     "We present a new differential compression algorithm
                 that combines the hash value techniques and suffix
                 array techniques of previous work. The term
                 ``differential compression'' refers to encoding a file
                 (a version file) as a set of changes with respect to
                 another file (a reference file). Previous differential
                 compression algorithms can be shown empirically to run
                 in linear time, but they have certain drawbacks;
                 namely, they do not find the best matches for every
                 offset of the version file. Our algorithm, hsadelta
                 (hash suffix array delta), finds the best matches for
                 every offset of the version file, with respect to a
                 certain granularity and above a certain length
                 threshold. The algorithm has two variations depending
                 on how we choose the block size. We show that if the
                 block size is kept fixed, the compression performance
                 of the algorithm is similar to that of the greedy
                 algorithm, without the associated expensive space and
                 time requirements. If the block size is varied linearly
                 with the reference file size, the algorithm can run in
                 linear time and constant space. We also show
                 empirically that the algorithm performs better than
                 other state-of-the-art differential compression
                 algorithms in terms of compression and is comparable in
                 speed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0246-00",
}

@Article{Altman:2006:P,
  author =       "E. Altman and S. Sathayes",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "169--171",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Agerwala:2006:SRC,
  author =       "T. Agerwala and M. Gupta",
  title =        "Systems research challenges: a scale-out
                 perspective",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "173--180",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/agerwala.html",
  abstract =     "A scale-out system is a collection of interconnected,
                 modular, low- cost computers that work as a single
                 entity to cooperatively provide applications, systems
                 resources, and data to users. The dominant programming
                 model for such systems consists of message passing at
                 the systems level and multithreading at the element
                 level. Scale-out computers have traditionally been
                 developed and deployed to provide levels of performance
                 (throughput and parallel processing) beyond what was
                 achievable by large shared-memory computers that
                 utilized the fastest processors and the most expensive
                 memory systems. Today, exploiting scale-out at all
                 levels in systems is becoming imperative in order to
                 overcome a fundamental discontinuity in the development
                 of microprocessor technology caused by power
                 dissipation. The pervasive use of greater levels of
                 scale-out, on the other hand, creates its own
                 challenges in architecture, programming, systems
                 management, and reliability. This position paper
                 identifies some of the important research problems that
                 must be addressed in order to deal with the technology
                 disruption and fully realize the opportunity offered by
                 scale-out. Our examples are based on parallelism, but
                 the challenges we identify apply to scale-out more
                 generally.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Wilcke:2006:IIB,
  author =       "W. W. Wilcke and R. B. Garner and C. Fleiner and R. F.
                 Freitas and R. A. Golding and J. S. Glider and D. R.
                 Kenchammana-Hosekote and J. L. Hafner and K. M.
                 Mohiuddin and KK Rao and R. A. Becker-Szendy and T. M.
                 Wong and O. A. Zaki and M. Hernandez and K. R.
                 Fernandez and H. Huels and H. Lenk and K. Smolin and M.
                 Ries and C. Goettert and T. Picunko and B. J. Rubin and
                 H. Kahn and T. Loo",
  title =        "{IBM Intelligent Bricks} project---Petabytes and
                 beyond",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "181--197",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/wilcke.html",
  abstract =     "This paper provides an overview of the Intelligent
                 Bricks project in progress at IBM Research. It
                 describes common problems faced by data center
                 operators and proposes a comprehensive solution based
                 on brick architectures. Bricks are hardware building
                 blocks. Because of certain properties, defined here,
                 scalable and reliable systems can be built with
                 collections of identical bricks. An important feature
                 is that brick-based systems must survive the failure of
                 any brick without requiring human intervention, as long
                 as most bricks are operational. This simplifies system
                 management and allows very dense and very scalable
                 systems to be built. A prototype storage server in the
                 form of a 3 3 3 3 3 array of bricks, capable of storing
                 26 TB, is operational at the IBM Almaden Research
                 Center. It successfully demonstrates the concepts of
                 the Intelligent Bricks architecture. The paper
                 describes this implementation of brick architectures
                 based on newly developed communication and cooling
                 technologies, the software developed, and techniques
                 for building very reliable systems from low-cost
                 bricks, and it discusses the performance and the future
                 of intelligent brick systems.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Fleiner:2006:RMM,
  author =       "C. Fleiner and R. B. Garner and J. L. Hafner and KK
                 Rao and D. R. Kenchammana-Hosekote and W. W. Wilcke and
                 J. S. Glider",
  title =        "Reliability of modular mesh-connected intelligent
                 storage brick systems",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "199--208",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/fleiner.html",
  abstract =     "A key objective of the IBM Intelligent Bricks project
                 is to create a highly reliable system from commodity
                 components. We envision such systems to be architected
                 for a service model called fail-in- place or deferred
                 maintenance. By delaying service actions, possibly for
                 the entire lifetime of the system, management of the
                 system is simplified. This paper examines the hardware
                 reliability and deferred maintenance of intelligent
                 storage brick (ISB) systems assuming a mesh-connected
                 collection of bricks in which each brick includes
                 processing power, memory, networking, and storage. On
                 the basis of Monte Carlo simulations, we quantify the
                 fraction of bricks that become unusable by a
                 distributed data redundancy scheme due to degrading
                 internal bandwidth and loss of external host
                 connectivity. We derive a system hardware reliability
                 expression and predict the length of time ISB systems
                 can operate without replacement of failed bricks. We
                 also show via a Markov analysis the level of fault
                 tolerance that is required by the data redundancy
                 scheme to achieve a goal of less than two data loss
                 events per exabyte-year due to multiple failures.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Bacon:2006:BFL,
  author =       "D. F. Bacon and X. Shen",
  title =        "Braids and fibers: Language constructs with
                 architectural support for adaptive responses to memory
                 latencies",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "209--221",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/bacon.html",
  abstract =     "As processor speeds continue to increase at a much
                 higher rate than memory speeds, memory latencies may
                 soon approach a thousand processor cycles. As a result,
                 the flat memory model that was made practical by deeply
                 pipelined superscalar processors with multilevel caches
                 will no longer be tenable. The most common approach to
                 this problem is multithreading; however, multithreading
                 requires either abundant independent applications or
                 well-parallelized monolithic applications, and neither
                 is easy to come by. We present high-level programming
                 constructs called braids and fibers. The programming
                 constructs facilitate the creation of programs that are
                 partially ordered, in which the partial orders can be
                 used to support adaptive responses to memory access
                 latencies. Braiding is simpler than parallelizing,
                 while yielding many of the same benefits. We show how
                 the programming constructs can be effectively supported
                 with simple instruction set architecture extensions and
                 microarchitectural enhancements. We have developed
                 braided versions of a number of important algorithms.
                 The braided code is easy to understand at the source
                 level and can be translated into highly efficient
                 instructions using our architecture extensions.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Dongarra:2006:SAN,
  author =       "J. Dongarra and G. Bosilca and Z. Chen and V. Eijkhout
                 and G. E. Fagg and E. Fuentes and J. Langou and P.
                 Luszczek and J. Pjesivac-Grbovic and K. Seymour and H.
                 You and S. S. Vadhiyar",
  title =        "{Self-Adapting Numerical Software} ({SANS}) effort",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "223--238",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/dongarra.html",
  abstract =     "The challenge for the development of next-generation
                 software is the successful management of the complex
                 computational environment while delivering to the
                 scientist the full power of flexible compositions of
                 the available algorithmic alternatives. Self-adapting
                 numerical software (SANS) systems are intended to meet
                 this significant challenge. The process of arriving at
                 an efficient numerical solution of problems in
                 computational science involves numerous decisions by a
                 numerical expert. Attempts to automate such decisions
                 distinguish three levels: algorithmic decision,
                 management of the parallel environment, and
                 processor-specific tuning of kernels. Additionally, at
                 any of these levels we can decide to rearrange the
                 user's data. In this paper we look at a number of
                 efforts at the University of Tennessee to investigate
                 these areas.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Cascaval:2006:PEM,
  author =       "C. Ca{\c{s}}caval and E. Duesterwald and P. F. Sweeney
                 and R. W. Wisniewski",
  title =        "Performance and environment monitoring for continuous
                 program optimization",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "239--248",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/cascaval.html",
  abstract =     "Our research is aimed at characterizing,
                 understanding, and exploiting the interactions between
                 hardware and software to improve system performance. We
                 have developed a paradigm for continuous program
                 optimization (CPO) that assists in and automates the
                 challenging task of performance tuning, and we have
                 implemented an initial prototype of this paradigm. At
                 the core of our implementation is a performance- and
                 environment-monitoring (PEM) component that vertically
                 integrates performance events from various layers in
                 the execution stack. CPO agents use the data provided
                 by PEM to detect, diagnose, and alleviate performance
                 problems on existing systems. In addition, CPO can be
                 used to improve future architecture designs by
                 analyzing PEM data collected on a whole-system
                 simulator while varying architectural characteristics.
                 In this paper, we present the CPO paradigm, describe an
                 initial implementation that includes PEM as a
                 component, and discuss two CPO clients.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Kandaswamy:2006:BWS,
  author =       "G. Kandaswamy and L. Fang and Y. Huang and S.
                 Shirasuna and S. Marru and D. Gannon",
  title =        "Building {Web} services for scientific grid
                 applications",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "249--260",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/kandaswamy.html",
  abstract =     "Web service architectures have gained popularity in
                 recent years within the scientific grid research
                 community. One reason for this is that web services
                 allow software and services from various organizations
                 to be combined easily to provide integrated and
                 distributed applications. However, most applications
                 developed and used by scientific communities are not
                 web-service-oriented, and there is a growing need to
                 integrate them into grid applications based on
                 service-oriented architectures. In this paper, we
                 describe a framework that allows scientists to provide
                 a web service interface to their existing applications
                 as web services without having to write extra code or
                 modify their applications in any way. In addition,
                 application providers do not need to be experts in web
                 services standards, such as Web Services Description
                 Language, Web Services Addressing, Web Services
                 Security, or secure authorization, because the
                 framework automatically generates these details. The
                 framework also enables users to discover these
                 application services, interact with them, and compose
                 scientific workflows from the convenience of a grid
                 portal.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Shetty:2006:HHT,
  author =       "R. Shetty and M. Kharbutli and Y. Solihin and M.
                 Prvulovic",
  title =        "{HeapMon}: a helper-thread approach to programmable,
                 automatic, and low-overhead memory bug detection",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "261--275",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/shetty.html",
  abstract =     "The ability to detect and pinpoint memory-related bugs
                 in production runs is important because in-house
                 testing may miss bugs. This paper presents HeapMon, a
                 heap memory bug-detection scheme that has a very low
                 performance overhead, is automatic, and is easy to
                 deploy. HeapMon relies on two new techniques. First, it
                 decouples application execution from bug monitoring,
                 which executes as a helper thread on a separate core in
                 a chip multiprocessor system. Second, it associates a
                 filter bit with each cached word to safely and
                 significantly reduce bug checking frequency--by 95\% on
                 average. We test the effectiveness of these techniques
                 using existing and injected memory bugs in SPEC 2000
                 applications and show that HeapMon effectively detects
                 and identifies most forms of heap memory bugs. Our
                 results also indicate that the HeapMon performance
                 overhead is only 5\%, on average--orders of magnitude
                 less than existing tools. Its overhead is also modest:
                 3.1\% of the cache size and a 32-KB victim cache for
                 on-chip filter bits and 6.2\% of the allocated heap
                 memory size for state bits, which are maintained by the
                 helper thread as a software data structure.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Belluomini:2006:LSD,
  author =       "W. Belluomini and D. Jamsek and A. K. Martin and C.
                 McDowell and R. K. Montoye and H. C. Ngo and
                 J. Sawada",
  title =        "Limited switch dynamic logic circuits for high-speed
                 low-power circuit design",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "277--286",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/belluomini.html",
  abstract =     "This paper describes a new circuit family--limited
                 switch dynamic logic (LSDL). LSDL is a hybrid between a
                 dynamic circuit and a static latch that combines the
                 desirable properties of both circuit families. The
                 paper also describes many enhancements and extensions
                 to LSDL that increase its logical capability. Finally,
                 it presents the results of two multiplier designs, one
                 fabricated in 130- nm technology and one in 90-nm
                 technology. The 130- and 90-nm designs respectively
                 reach speeds up to 2.2 GHz and 8 GHz.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Baugh:2006:DLQ,
  author =       "L. Baugh and C. Zilles",
  title =        "Decomposing the load--store queue by function for
                 power reduction and scalability",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "287--297",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/baugh.html",
  abstract =     "Because they are based on large, content-addressable
                 memories, load\slash store queues (LSQs) present
                 implementation challenges in superscalar processors. In
                 this paper, we propose an alternate LSQ organization
                 that separates the time-critical forwarding
                 functionality from the process of checking that loads
                 received their correct values. Two main techniques are
                 exploited: First, the store- forwarding logic is
                 accessed only by those loads and stores that are likely
                 to be involved in forwarding, and second, the checking
                 structure is banked by address. The result of these
                 techniques is that the LSQ can be implemented by a
                 collection of small, low- bandwidth structures yielding
                 an estimated three to five times reduction in LSQ
                 dynamic power.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Cheng:2006:HQI,
  author =       "A. C. Cheng and G. S. Tyson",
  title =        "High-quality {ISA} synthesis for low-power cache
                 designs in embedded microprocessors",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "299--309",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/cheng.html",
  abstract =     "Energy efficiency, performance, area, and cost are
                 critical concerns in designing microprocessors for
                 embedded systems, such as portable handheld computing
                 and personal telecommunication devices. This work
                 introduces framework-based instruction set architecture
                 (ISA) synthesis, which reduces code size and energy
                 consumption by tailoring the instruction set to the
                 requirement of a targeted application. This is achieved
                 by replacing the fixed instruction and register
                 decoding of general-purpose embedded processors with
                 programmable decoders that can achieve
                 application-specific processor performance, low energy
                 consumption, and smaller code size while maintaining
                 the fabrication advantages of a mass-produced
                 single-chip solution. Experimental results show that
                 our synthesized instruction set results in significant
                 power reduction in the L1 instruction cache compared
                 with ARM instructions.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Carter:2006:MWD,
  author =       "N. P. Carter and A. Hussain",
  title =        "Modeling wire delay, area, power, and performance in a
                 simulation infrastructure",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "311--319",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/carter.html",
  abstract =     "We present Justice, a set of extensions to the Liberty
                 simulation infrastructure that model chip area, wire
                 length, and power consumption. Based on an
                 architectural specification of a processor, Justice
                 estimates the area and per-access power consumption of
                 each module in the architecture. It then constructs a
                 floorplan for the processor and computes the length and
                 delay of critical communication paths. Finally, Justice
                 modifies the architectural specification to account for
                 wire delay and generates an executable simulator for
                 the processor. To illustrate its capabilities, we
                 simulate a number of very long instruction word (VLIW)
                 architectures. Our results illustrate how Justice makes
                 it possible for designers to compare the costs and
                 benefits of different changes to an architecture and
                 demonstrate the importance of considering wire delay
                 early in the design process.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Peterson:2006:AFS,
  author =       "J. L. Peterson and P. J. Bohrer and L. Chen and E. N.
                 Elnozahy and A. Gheith and R. H. Jewell and M. D.
                 Kistler and T. R. Maeurer and S. A. Malone and D. B.
                 Murrell and N. Needel and K. Rajamani and M. A. Rinaldi
                 and R. O. Simpson and K. Sudeep and L. Zhang",
  title =        "Application of full-system simulation in exploratory
                 system design and development",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "321--332",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/502/peterson.html",
  abstract =     "This paper describes the design and application of a
                 full-system simulation environment that has been widely
                 used in the exploration of the IBM PowerPC processor
                 and system design. The IBM full-system simulator has
                 been developed to meet the needs of hardware and
                 software designers for fast, accurate, execution-driven
                 simulation of complete systems, incorporating
                 parameterized architectural models. This environment
                 enables the development and tuning of production-level
                 operating systems, compilers, and critical software
                 support well in advance of hardware availability, which
                 can significantly shorten the critical path of system
                 development. The ability to develop early versions of
                 software can benefit hardware development by
                 identifying design issues that may affect functionality
                 and performance far earlier in the development cycle,
                 when they are much less costly to correct. In this
                 paper, we describe features of the simulation
                 environment and present examples of its application in
                 the context of the Sony\slash Toshiba\slash IBM Cell
                 Broadband Enginee and IBM PERCS development projects.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Anonymous:2006:EDM,
  author =       "Anonymous",
  title =        "Erratum: {{\em Development of the magnetic tunnel
                 junction MRAM at IBM}}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "2/3",
  pages =        "333--333",
  month =        mar # "\slash " # may,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Gallagher:2006:DMT}.",
  URL =          "http://www.research.ibm.com/journal/rd/502/erratum.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0247-00",
}

@Article{Haensch:2006:P,
  author =       "W. Haensch and M. Ieongs",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "337--338",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Haensch:2006:SCD,
  author =       "W. Haensch and E. J. Nowak and R. H. Dennard and P. M.
                 Solomon and A. Bryant and O. H. Dokumaci and A. Kumar
                 and X. Wang and J. B. Johnson and M. V. Fischetti",
  title =        "Silicon {CMOS} devices beyond scaling",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "339--362",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See erratum \cite{Anonymous:2006:ESC}.",
  URL =          "http://www.research.ibm.com/journal/rd/504/haensch.html",
  abstract =     "To a large extent, scaling was not seriously
                 challenged in the past. However, a closer look reveals
                 that early signs of scaling limits were seen in
                 high-performance devices in recent technology nodes. To
                 obtain the projected performance gain of 30\% per
                 generation, device designers have been forced to relax
                 the device subthreshold leakage continuously from one
                 to several nA/lm for the 250-nm node to hundreds of
                 nA/lm for the 65-nm node. Consequently, passive power
                 density is now a significant portion of the power
                 budget of a high-speed microprocessor. In this paper we
                 discuss device and material options to improve device
                 performance when conventional scaling is
                 power-constrained. These options can be separated into
                 three categories: improved short-channel behavior,
                 improved current drive, and improved switching
                 behavior. In the first category fall advanced
                 dielectrics and multi-gate devices. The second category
                 comprises mobility-enhancing measures through stress
                 and substrate material alternatives. The third category
                 focuses mainly on scaling of SOI body thickness to
                 reduce capacitance. We do not provide details of the
                 fabrication of these different device options or the
                 manufacturing challenges that must be met. Rather, we
                 discuss the fundamental scaling issues related to the
                 various device options. We conclude with a brief
                 discussion of the ultimate FET close to the fundamental
                 silicon device limit.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Antoniadis:2006:CMP,
  author =       "D. A. Antoniadis and I. Aberg and C. N{\'\i}
                 Chl{\'e}irigh and O. M. Nayfeh and A. Khakifirooz and
                 J. L. Hoyt",
  title =        "Continuous {MOSFET} performance increase with device
                 scaling: The role of strain and channel material
                 innovations",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "363--376",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See erratum \cite{Anonymous:2006:ESC}.",
  URL =          "http://www.research.ibm.com/journal/rd/504/antoniadis.html",
  abstract =     "A simple model that links MOSFET performance, in the
                 form of intrinsic switch delay, to effective carrier
                 velocity in the channel is developed and fitted to
                 historical data. It is shown that nearly continuous
                 carrier velocity increase, most recently via the
                 introduction of process-induced strain, has been
                 responsible for the device performance increase
                 commensurately with dimensional scaling. The paper
                 further examines channel material innovations that will
                 be required in order to maintain continued commensurate
                 scaling beyond what can be achieved with
                 process-induced strain, and discusses some of the
                 technological tradeoffs that will have to be faced for
                 their introduction.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Shang:2006:GCM,
  author =       "H. Shang and M. M. Frank and E. P. Gusev and J. O. Chu
                 and S. W. Bedell and K. W. Guarini and M. Ieong",
  title =        "Germanium channel {MOSFET}s: Opportunities and
                 challenges",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "377--386",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/shang.html",
  abstract =     "This paper reviews progress and current critical
                 issues with respect to the integration of germanium
                 (Ge) surface-channel MOSFET devices as well as
                 strained-Ge buried-channel MOSFET structures. The
                 device design and scalability of strained-Ge
                 buried-channel MOSFETs are discussed on the basis of
                 our recent results. CMOS- compatible integration
                 approaches of Ge channel devices are presented.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Gusev:2006:AHK,
  author =       "E. P. Gusev and V. Narayanan and M. M. Frank",
  title =        "Advanced high-{$\kappa$} dielectric stacks with
                 {polySi} and metal gates: Recent progress and current
                 challenges",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "387--410",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/gusev.html",
  abstract =     "The paper reviews our recent progress and current
                 challenges in implementing advanced gate stacks
                 composed of high-j dielectric materials and metal gates
                 in mainstream Si CMOS technology. In particular, we
                 address stacks of doped polySi gate electrodes on
                 ultrathin layers of high-j dielectrics,
                 dual-workfunction metal-gate technology, and fully
                 silicided gates. Materials and device characterization,
                 processing, and integration issues are discussed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Hiramoto:2006:ENS,
  author =       "T. Hiramoto and M. Saitoh and G. Tsutsui",
  title =        "Emerging nanoscale silicon devices taking advantage of
                 nanostructure physics",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "411--418",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/hiramoto.html",
  abstract =     "This paper describes the present status of research on
                 emerging nanoscale silicon devices that take full
                 advantage of new physical phenomena which appear in
                 silicon nanostructures. This new physics includes
                 quantum effects that enhance the performance of MOS
                 transistors and single-electron charging effects that
                 add new function to conventional CMOS circuits. These
                 physical phenomena may be used to extend the scaling
                 and performance limits of conventional CMOS.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Frank:2006:OCT,
  author =       "D. J. Frank and W. Haensch and G. Shahidi and O. H.
                 Dokumaci",
  title =        "Optimizing {CMOS} technology for maximum performance",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "419--431",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/frank.html",
  abstract =     "Since power dissipation is becoming a dominant
                 limitation on the continued improvement of CMOS
                 technology, technologists must understand the best way
                 to design transistors in the presence of power
                 constraints. The primary objective is to obtain as much
                 performance as possible for a fixed amount of power,
                 and it is chip performance, not device performance,
                 that matters. In order to investigate this regime, we
                 have captured in simplified models the basic elements
                 for determining chip performance, including intrinsic
                 transistor characteristics, circuit delay, tolerance
                 issues, basic microprocessor composition, and power
                 dissipation and heat removal considerations. These
                 models have been assembled in a processor-level
                 technology-optimization program to study the
                 characteristics of optimal technology across many
                 generations of CMOS. The results that are presented
                 elucidate the limits of future CMOS technology
                 improvements, the optimal energy consumption
                 conditions, and the relative benefits of various
                 proposed technology enhancements, including high-k gate
                 insulators, metal gates, high- mobility semiconductors,
                 improved heat removal, and the use of multiple layers
                 of circuitry.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Bernstein:2006:HPC,
  author =       "K. Bernstein and D. J. Frank and A. E. Gattiker and W.
                 Haensch and B. L. Ji and S. R. Nassif and E. J. Nowak
                 and D. J. Pearson and N. J. Rohrer",
  title =        "High-performance {CMOS} variability in the 65-nm
                 regime and beyond",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "433--449",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/bernstein.html",
  abstract =     "Recent changes in CMOS device structures and materials
                 motivated by impending atomistic and quantum-mechanical
                 limitations have profoundly influenced the nature of
                 delay and power variability. Variations in process,
                 temperature, power supply, wear-out, and use history
                 continue to strongly influence delay. The manner in
                 which tolerance is specified and accommodated in
                 high-performance design changes dramatically as CMOS
                 technologies scale beyond a 90-nm minimum lithographic
                 linewidth. In this paper, predominant contributors to
                 variability in new CMOS devices are surveyed, and
                 preferred approaches to mitigate their sources of
                 variability are proposed. Process-, device-, and
                 circuit-level responses to systematic and random
                 components of tolerance are considered. Exploratory,
                 novel structures emerging as evolutionary CMOS
                 replacements are likely to change the nature of
                 variability in the coming generations.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Ketchen:2006:PRS,
  author =       "M. B. Ketchen and M. Bhushan",
  title =        "Product-representative ``at speed'' test structures
                 for {CMOS} characterization",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "451--468",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/ketchen.html",
  abstract =     "The design of product-representative test structures
                 for measuring and characterizing CMOS circuit
                 performance, power, and variability at speeds
                 characteristic of present-day microprocessors is
                 described. The current use of this set of test
                 structures in the IBM partially depleted
                 silicon-on-insulator CMOS technologies covers
                 diagnostics in early process development, monitoring
                 mature processes in manufacturing, enabling
                 model-to-hardware correlation, and tracking product
                 performance. The designs focus on measuring
                 high-frequency performance early in the product
                 fabrication cycle while minimizing test and data
                 analysis time. The physical layouts are compact,
                 facilitating placement in the chip. A subset of these
                 test structures can be measured at the first metal
                 level, while more complex designs use three or more
                 metal layers. Most designs are compatible with standard
                 in-line parametric test equipment, although a limited
                 number of bench tests continue to play an important
                 role. Differential measurement techniques are key to
                 many of the test structure designs. Hardware data
                 analysis also relies heavily on differencing schemes
                 for relating MOSFET parameters and associated parasitic
                 components to circuit delays in a self-consistent
                 manner.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Hanson:2006:UVM,
  author =       "S. Hanson and B. Zhai and K. Bernstein and D. Blaauw
                 and A. Bryant and L. Chang and K. K. Das and W. Haensch
                 and E. J. Nowak and D. M. Sylvester",
  title =        "Ultralow-voltage, minimum-energy {CMOS}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "469--490",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/hanson.html",
  abstract =     "Energy efficiency has become a ubiquitous design
                 requirement for digital circuits. Aggressive
                 supply-voltage scaling has emerged as the most
                 effective way to reduce energy use. In this work, we
                 review circuit behavior at low voltages, specifically
                 in the subthreshold (Vdd, Vth) regime, and suggest new
                 strategies for energy-efficient design. We begin with a
                 study at the device level, and we show that extreme
                 sensitivity to the supply and threshold voltages
                 complicates subthreshold design. The effects of this
                 sensitivity can be minimized through simple device
                 modifications and new device geometries. At the circuit
                 level, we review the energy characteristics of
                 subthreshold logic and SRAM circuits, and demonstrate
                 that energy efficiency relies on the balance between
                 dynamic and leakage energies, with process variability
                 playing a key role in both energy efficiency and
                 robustness. We continue the study of energy-efficient
                 design by broadening our scope to the architectural
                 level. We discuss the energy benefits of techniques
                 such as multiple-threshold CMOS (MTCMOS) and adaptive
                 body biasing (ABB), and we also consider the
                 performance benefits of multiprocessor design at
                 ultralow supply voltages.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Topol:2006:TDI,
  author =       "A. W. Topol and D. C. {La Tulipe, Jr.} and L. Shi and
                 D. J. Frank and K. Bernstein and S. E. Steen and
                 A. Kumar and G. U. Singco and A. M. Young and
                 K. W. Guarini and M. Ieong",
  title =        "Three-dimensional integrated circuits",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "491--506",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/topol.html",
  abstract =     "Three-dimensional (3D) integrated circuits (ICs),
                 which contain multiple layers of active devices, have
                 the potential to dramatically enhance chip performance,
                 functionality, and device packing density. They also
                 provide for microchip architecture and may facilitate
                 the integration of heterogeneous materials, devices,
                 and signals. However, before these advantages can be
                 realized, key technology challenges of 3D ICs must be
                 addressed. More specifically, the processes required to
                 build circuits with multiple layers of active devices
                 must be compatible with current state-of-the-art
                 silicon processing technology. These processes must
                 also show manufacturability, i.e., reliability, good
                 yield, maturity, and reasonable cost. To meet these
                 requirements, IBM has introduced a scheme for building
                 3D ICs based on the layer transfer of functional
                 circuits, and many process and design innovations have
                 been implemented. This paper reviews the process steps
                 and design aspects that were developed at IBM to enable
                 the formation of stacked device layers. Details
                 regarding an optimized layer transfer process are
                 presented, including the descriptions of (1) a glass
                 substrate process to enable through-wafer alignment;
                 (2) oxide fusion bonding and wafer bow compensation
                 methods for improved alignment tolerance during
                 bonding; (3) and a single-damascene patterning and
                 metallization method for the creation of
                 high-aspect-ratio (6:1, AR, 11:1) contacts between
                 two stacked device layers. This process provides the
                 shortest distance between the stacked layers (,2 lm),
                 the highest interconnection density (.108 vias/cm2),
                 and extremely aggressive wafer-to-wafer alignment
                 (submicron) capability.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Franaszek:2006:VMC,
  author =       "P. A. Franaszek and L. A. Lastras-Monta{\~n}o and S.
                 R. Kunkel and A. C. Sawdey",
  title =        "Victim management in a cache hierarchy",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "507--523",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/franaszek.html",
  abstract =     "We investigate directions for exploiting what might be
                 termed pattern locality in a cache hierarchy, based on
                 recording cache discards or victims. An advantage of
                 storing discard decisions is the reduced duplication of
                 pertinent information, as well as the maintenance of
                 information on the current location of discarded lines.
                 Typical caches are designed to exploit combinations of
                 temporal and spatial locality. Temporal locality, the
                 likelihood that recently referenced data will be
                 referenced again, is exploited by LRU-like algorithms.
                 Spatial locality is the property that causes larger
                 cache lines to yield improved miss ratios. Here we
                 consider the exploitation of pattern locality--the
                 property that lines accessed in temporal proximity tend
                 to be re-referenced together. We describe some new
                 cache structures including pattern-recording features,
                 along with their miss ratio and transfer traffic
                 performance as determined via simulations on traces
                 drawn from several benchmark applications. We show that
                 pattern locality information, based on discard
                 statistics, can be useful in enhancing the quality of
                 prefetch decisions.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Chen:2006:MVP,
  author =       "T.-C. Chen",
  title =        "Message from the {Vice President, Science and
                 Technology, IBM Research Division}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "4/5",
  pages =        "??--??",
  month =        jul # "\slash " # sep,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:31 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/504/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0248-00",
}

@Article{Burbeck:2006:P,
  author =       "S. Burbeck and K. E. Jordans",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "527--528",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Burbeck:2006:ARC,
  author =       "S. Burbeck and K. E. Jordan",
  title =        "An assessment of the role of computing in systems
                 biology",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "529--543",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/burbeck.html",
  abstract =     "Systems biology is a burgeoning field in which
                 researchers are investigating a flood of new data that
                 is gathered in high- throughput genomics, proteomics,
                 and related analyses. Systems biologists focus on what
                 this data reveals about the functioning of living
                 systems. The large volume of data, and the complexity
                 of living systems, ensures that computing plays a
                 central role in analyzing, modeling, and simulating
                 these systems. In this paper, we discuss some of the
                 key challenges in the field of computational systems
                 biology. We also discuss possible ways in which the
                 field of systems biology may evolve in coming years,
                 along with some of the demands that systems biology
                 research places on computing resources.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Eckman:2006:GDM,
  author =       "B. A. Eckman and P. G. Brown",
  title =        "Graph data management for molecular and cell biology",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "545--560",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/eckman.html",
  abstract =     "As high-throughput biology begins to generate large
                 volumes of systems biology data, the need grows for
                 robust, efficient database systems to support
                 investigations of metabolic and signaling pathways,
                 chemical reaction networks, gene regulatory networks,
                 and protein interaction networks. Network data is
                 frequently represented as graphs, and researchers need
                 to navigate, query and manipulate this data in ways
                 that are not well supported by standard relational
                 database management systems (RDBMSs). Current
                 approaches to managing graphs in an RDBMS rely on
                 either external procedural logic to execute the graph
                 algorithms or clumsy and inefficient algorithms
                 implemented in Structured Query Language (SQL). In this
                 paper we describe the Systems Biology Graph Extender, a
                 research prototype that extends the IBM RDBMS--DB2t
                 Universal Database software--with graph objects and
                 operations to support declarative SQL queries over
                 biological networks and other graph structures.
                 Supported operations include neighborhood queries,
                 shortest path queries, spanning trees, graph
                 transposition, and graph matching. In a federated
                 database environment, graph operations may be applied
                 to data stored in any format, whether remote or local,
                 relational or nonrelational. A single federated query
                 may include both graph- based predicates and predicates
                 over related data sources, such as microarray
                 expression levels, clinical prognosis and outcome, or
                 the function of orthologous proteins (i.e., proteins
                 that are evolutionarily related to those in another
                 species) in mouse disease models.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Sorokin:2006:PET,
  author =       "A. Sorokin and K. Paliy and A. Selkov and O. V. Demin
                 and S. Dronov and P. Ghazal and I. Goryanin",
  title =        "The {Pathway Editor}: a tool for managing complex
                 biological networks",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "561--573",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/sorokin.html",
  abstract =     "Biological networks are systems of biochemical
                 processes inside a cell that involve cellular
                 constituents such as DNA, RNA, proteins, and various
                 small molecules. Pathway maps are often used to
                 represent the structure of such networks with
                 associated biological information. Several pathway
                 editors exist, and they vary according to specific
                 domains of knowledge. This paper presents a review of
                 existing pathway editors, along with an introduction to
                 the Edinburgh Pathway Editor (EPE). EPE was designed
                 for the annotation, visualization, and presentation of
                 a wide variety of biological networks that include
                 metabolic, genetic, and signal transduction pathways.
                 EPE is based on a metadata-driven architecture. The
                 editor supports the presentation and annotation of
                 maps, in addition to the storage and retrieval of
                 reaction kinetics information in relational databases
                 that are either local or remote. EPE also has
                 facilities for linking graphical objects to external
                 databases and Web resources, and is capable of
                 reproducing most existing graphical notations and
                 visual representations of pathway maps. In summary, EPE
                 provides a highly flexible tool for combining
                 visualization, editing, and database manipulation of
                 information relating to biological networks. EPE is
                 open-source software, distributed under the Eclipse
                 open-source application platform license.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Podowski:2006:VCS,
  author =       "R. M. Podowski and B. Miller and W. W. Wasserman",
  title =        "Visualization of complementary systems biology data
                 with parallel heatmaps",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "575--581",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/podowski.html",
  abstract =     "The interpretation of large-scale biological data can
                 be aided by the use of appropriate visualization tools.
                 Heatmaps--pattern- revealing aggregate views of
                 data--have emerged as a preferred technique for the
                 display of genomics data, since they provide an extra
                 dimension of information in a two-dimensional display.
                 However, an increasing focus on the integration of data
                 from multiple sources has created a need for the
                 display of additional dimensions. To improve the
                 identification of relationships between co-expressed
                 genes identified in microarray experiments, a parallel
                 dataset heatmap viewer has been developed for
                 four-dimensional data display. The flexible data entry
                 structure of the parallel heatmap viewer facilitates
                 the display of both continuous and discrete data.
                 Specific examples are presented for the analysis of
                 diverse functional genomics yeast data related to gene
                 regulation, expression, and annotation. The parallel
                 heatmap viewer enables knowledgeable life science
                 researchers to observe patterns and properties within
                 high-throughput genomics data in order to rapidly
                 identify biologically logical relationships.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Hussan:2006:SDM,
  author =       "J. Hussan and P. P. de Tombe and J. J. Rice",
  title =        "A spatially detailed myofilament model as a basis for
                 large-scale biological simulations",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "583--600",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/hussan.html",
  abstract =     "The availability of increased computing power will
                 make possible new classes of biological models that
                 include detailed representations of proteins and
                 protein complexes with spatial interactions. We develop
                 such a model of the interaction of actin and myosin
                 within one pair of thick and thin filaments in the
                 cardiac sarcomere. The model includes explicit
                 representations of actin, myosin, and regulatory
                 proteins. Although this is not an atomic-scale model,
                 as would be the case for molecular dynamics
                 simulations, the model seeks to represent spatial
                 interactions between protein complexes that are thought
                 to produce characteristic cardiac muscle responses at
                 larger scales. While the model simulates the
                 microscopic scale, when model results are extrapolated
                 to larger structures, the model recapitulates complex,
                 nonlinear behavior such as the steep calcium
                 sensitivity of developed force in muscle structures. By
                 bridging spatial scales, the model provides a plausible
                 and quantitative explanation for several unexplained
                 phenomena observed at the tissue level in cardiac
                 muscles. Model execution entails Monte-Carlo-based
                 simulations of Markov representations of calcium
                 regulation and actin\slash myosin interactions. While
                 most of the results presented here are preliminary, we
                 suggest that this model will be suitable to serve as a
                 basis for larger-scale simulations of multiple fibers
                 assembled into larger sarcomere structures.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Peirce:2006:MBI,
  author =       "S. M. Peirce and T. C. Skalak and J. A. Papin",
  title =        "Multiscale biosystems integration: Coupling
                 intracellular network analysis with tissue-patterning
                 simulations",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "601--615",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/peirce.html",
  abstract =     "In order to achieve a comprehensive understanding of
                 complex biological systems, researchers must develop
                 new techniques that incorporate key features of the
                 system across all relevant spatial and temporal scales.
                 Recent advances in molecular biology and genetics have
                 generated a wealth of experimental data that provides
                 details with respect to gene-expression patterns and
                 individual gene and protein functions, but integration
                 of this information into meaningful knowledge of the
                 complete system is a challenge borne by a new
                 scientific era dependent on computational tools. In
                 this paper, we review new computational techniques,
                 developed to reconstruct single-cell biochemical
                 networks for generating quantitative descriptions of
                 network properties, and agent-based models designed to
                 study multicell interactions important in tissue
                 patterning. We also discuss the challenges and promises
                 of combining these approaches in a single quantitative
                 framework for advancing medical care for diseases that
                 arise from a multitude of factors.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Nickerson:2006:CMM,
  author =       "D. Nickerson and M. Nash and P. Nielsen and N. Smith
                 and P. Hunter",
  title =        "Computational multiscale modeling in the {IUPS
                 Physiome Project}: Modeling cardiac electromechanics",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "617--630",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/nickerson.html",
  abstract =     "We present a computational modeling and numerical
                 simulation framework that enables the integration of
                 multiple physics and spatiotemporal scales in models of
                 physiological systems. This framework is the foundation
                 of the IUPS (International Union of Physiological
                 Sciences) Physiome Project. One novel aspect is the use
                 of CellML, an annotated mathematical representation
                 language, to specify model- and simulation-specific
                 equations. Models of cardiac electromechanics at the
                 cellular, tissue, and organ spatial scales are outlined
                 to illustrate the development and implementation of the
                 framework. We quantify the computational demands of
                 performing simulations using such models and compare
                 models of differing biophysical detail. Applications to
                 other physiological systems are also discussed.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Holloway:2006:MLM,
  author =       "D. T. Holloway and M. A. Kon and C. DeLisi",
  title =        "Machine learning methods for transcription data
                 integration",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "631--643",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/holloway.html",
  abstract =     "Gene expression is modulated by transcription factors
                 (TFs), which are proteins that generally bind to DNA
                 adjacent to coding regions and initiate transcription.
                 Each target gene can be regulated by more than one TF,
                 and each TF can regulate many targets. For a complete
                 molecular understanding of transcriptional regulation,
                 researchers must first associate each TF with the set
                 of genes that it regulates. Here we present a summary
                 of completed work on the ability to associate 104 TFs
                 with their binding sites using support vector machines
                 (SVMs), which are classification algorithms based in
                 statistical learning theory. We use several types of
                 genomic datasets to train classifiers in order to
                 predict TF binding in the yeast genome. We consider
                 motif matches, subsequence counts, motif conservation,
                 functional annotation, and expression profiles. A
                 simple weighting scheme varies the contribution of each
                 type of genomic data when building a final SVM
                 classifier, which we evaluate using known binding sites
                 published in the literature and in online databases.
                 The SVM algorithm works best when all datasets are
                 combined, producing 73\% coverage of known
                 interactions, with a prediction accuracy of almost 0.9.
                 We discuss new ideas and preliminary work for improving
                 SVM classification of biological data.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Schoeberl:2006:MBD,
  author =       "B. Schoeberl and U. B. Nielsen and R. Paxson",
  title =        "Model-based design approaches in drug discovery: a
                 parallel to traditional engineering approaches",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "645--651",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/schoeberl.html",
  abstract =     "Model-based design (MBD) has been successfully applied
                 in the automotive, chemical, and aerospace industries.
                 Here we discuss the possible application of
                 engineering-based MBD approaches to drug discovery. One
                 of the biggest challenges in drug discovery is the high
                 attrition rate of new drugs in development: Many
                 promising candidates prove ineffective or toxic in
                 animal or human testing. More often than not, these
                 failures are the result of a poor understanding of the
                 molecular mechanisms of the biological systems they
                 target. Recent advances in biological systems modeling
                 make MBD an attractive approach to improve drug
                 development. We elaborate on the view that the
                 pharmaceutical industry should be able to use MBD to
                 design new drugs more effectively. There are
                 significant differences between drug discovery and
                 traditional engineering that lead to specific MBD
                 requirements. We delineate those differences and
                 introduce suggestions to overcome them.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Anonymous:2006:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 50",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "653--657",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/authv50.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Anonymous:2006:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 50",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "659--663",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/subjv50.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Anonymous:2006:ESC,
  author =       "Anonymous",
  title =        "Errata: {{\em Silicon CMOS Devices Beyond Scaling}}
                 and {{\em Continuous MOSFET Performance Increase with
                 Device Scaling}}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "665--665",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Haensch:2006:SCD} and
                 \cite{Antoniadis:2006:CMP}.",
  URL =          "http://www.research.ibm.com/journal/rd/506/errata.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Kovac:2006:MGM,
  author =       "Caroline A. Kovac",
  title =        "Message from the {General Manager, Healthcare and Life
                 Sciences Industry, IBM Public Sector}",
  journal =      j-IBM-JRD,
  volume =       "50",
  number =       "6",
  pages =        "??--??",
  month =        nov,
  year =         "2006",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:16:32 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/506/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "G322-0249-00",
}

@Article{Turgeon:2007:P,
  author =       "P. R. Turgeon",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "3--??",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Poindexter:2007:OST,
  author =       "D. J. Poindexter and S. R. Stiffler and P. T. Wu and
                 P. D. Agnello and T. Ivers and S. Narasimha and T. B.
                 Faure and J. H. Rankin and D. A. Grosch and M. D. Knox
                 and D. Edelstein and M. Khare and G. B. Bronner and
                 H.-J. Nam and S. A. Butt",
  title =        "Optimization of silicon technology for the {IBM System
                 z9}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "5--??",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Mayer:2007:DMA,
  author =       "G. Mayer and G. Doettling and R. F. Rizzolo and C. J.
                 Berry and S. M. Carey and C. M. Carney and J. Keinert
                 and P. Loeffler and W. Nop and D. E. Skooglund and V.
                 A. Victoria and A. P. Wagstaff and P. M. Williams",
  title =        "Design methods for attaining {IBM System z9} processor
                 cycle-time goals",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "19--35",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/mayer.html",
  abstract =     "Cycle-time targets were set for the IBM System z9e
                 processor subsystem prior to building the system, and
                 achieving these targets was one of the biggest
                 challenges we faced during hardware development. In
                 particular, although the processor-subsystem cycle-time
                 improvement was driven primarily by the technology
                 migration from CMOS 9S (130-nm lithography) for the
                 prior IBM System z990 to CMOS 10S0 (90-nm lithography)
                 for the new system, the cooling capability for the
                 System z9 resulted from a direct migration of the
                 System z990 implementation with very limited
                 improvements. The higher device current leakage and
                 power associated with the technology migration,
                 combined with the fixed cooling capability, created a
                 technology challenge in which the subsystem cycle time
                 and performance were potentially limited by cooling
                 capability. Our solution emphasized silicon technology
                 development, chip design, and hardware characterization
                 and tuning. Ultimately, the System z9 processor
                 subsystem achieved operation at 1.7 GHz, which exceeded
                 the original target.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Harrer:2007:HSI,
  author =       "H. Harrer and D. M. Dreps and T.-M. Winkel and W.
                 Scholz and B. G. Truong and A. Huber and T. Zhou and K.
                 L. Christian and G. F. Goth",
  title =        "High-speed interconnect and packaging design of the
                 {IBM System z9} processor cage",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "37--52",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/harrer.html",
  abstract =     "This paper describes the system packaging and
                 technologies of the IBM System z9e enterprise-class
                 server. The central electronic complex of the system
                 consists of four nodes, each housing a multichip module
                 (MCM) with 16 chips consuming up to 1,200 W. The z9e
                 server doubles the multiprocessor performance of the
                 System z990 by increasing the central processing unit
                 (CPU) configuration and using an internally developed
                 elastic interface to increase interconnect speed on all
                 high-speed buses. In contrast to all previous zSeries
                 designs, which were running at half of the processor
                 speed, the packaging interconnects on the multichip
                 module run at the same speed as the processor (1.72
                 GHz). High frequencies and massively parallel
                 connectivity lead to a raw packaging bandwidth of up to
                 1,764 GB/s between processors and cache within a single
                 frame for a fully configured four-node z9 system.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Berger:2007:HSS,
  author =       "D. M. Berger and J. Y. Chen and F. D. Ferraiolo and J.
                 A. Magee and G. A. {Van Huben}",
  title =        "High-speed source-synchronous interface for the {IBM
                 System z9} processor",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "53--64",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/berger.html",
  abstract =     "As mainframes evolve and deliver higher performance,
                 technologists are focusing less on processor speed and
                 more on overall system performance to create optimized
                 systems. One important area of focus for performance
                 improvement involves chip-to-chip interconnects, with
                 their associated bandwidths and latencies. IBM and
                 related computer manufacturers are optimizing the
                 characteristics of interconnects between processors as
                 well as between processors and their supporting chip
                 sets (local cache, memory, I/O bridge). This paper
                 describes the IBM proprietary high-speed interface
                 known as Elastic Interface (EI), which is used for
                 nearly all chip-to-chip communication in the IBM System
                 z9e. In particular, EI is a generic high-speed,
                 source-synchronous interface used to transfer
                 addresses, controls, and data between CPUs, L2 caches,
                 memory subsystems, switches, and I/O hubs. The EI has
                 single-ended data lines, resulting in twice the
                 performance (bandwidth per pin) of similar buses
                 operating with two differential lines per signal.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Rizzolo:2007:ISZ,
  author =       "R. F. Rizzolo and T. G. Foote and J. M. Crafts and D.
                 A. Grosch and T. O. Leung and D. J. Lund and B. L.
                 Mechtly and B. J. Robbins and T. J. Slegel and M. J.
                 Tremblay and G. A. Wiedemeier",
  title =        "{IBM System z9 eFUSE} applications and methodology",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "65--??",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Wyman:2007:ZZI,
  author =       "L. W. Wyman and J. Casta{\~n}o and J. P. Kubala and R.
                 J. Maddison and B. R. Pierce and R. R. Rogers",
  title =        "{zAAPs} and {zIIPs}: Increasing the strategic value of
                 {System z}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "77--86",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/wyman.html",
  abstract =     "With the addition of IBM System z application assist
                 processors (zAAPs) and integrated information
                 processors (zIIPs) to the portfolio of special-purpose
                 IBM System z processors, the reinvention of the IBM
                 mainframe continues. Jointly, zAAPs and zIIPs provide
                 significant IBM System z9e integrated and
                 cost-effective processing cycles for today's strategic
                 Javae and DB2t for z/OS programming platforms which are
                 increasingly fundamental to enterprise-class business
                 environments. Overviews of zAAPs and zIIPs are
                 presented that describe their functionality, design,
                 and use by the z/OS operating system to achieve the
                 execution of both Java and z/OS DB2 programming
                 functions.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Arnold:2007:CSE,
  author =       "T. W. Arnold and A. Dames and M. D. Hocker and M. D.
                 Marik and N. A. Pellicciotti and K. Werner",
  title =        "Cryptographic system enhancements for the {IBM System
                 z9}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "87--102",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/arnold.html",
  abstract =     "IBM has offered hardware-based cryptographic
                 processors for its mainframe computers for nearly
                 thirty years. Over that period, IBM has continued to
                 update both the hardware and software, providing added
                 features, higher performance, greater physical
                 security, and improved management features. This
                 commitment continues with the System z9e, as
                 demonstrated by the two improvements described in this
                 paper. The first part of the paper describes
                 enhancements to the System z9 to configure and control
                 cryptographic features. The second part describes a new
                 method for the cryptographic coprocessors to securely
                 manage keys which are distributed to remote devices
                 that are not necessarily in secure or well-controlled
                 environments.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Srikrishnan:2007:SFA,
  author =       "J. Srikrishnan and S. Amann and G. Banzhaf and F. W.
                 Brice and R. Dugan and G. R. Frazier and G. P. Kuch and
                 J. Leopold",
  title =        "Sharing {FCP} adapters through virtualization",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "103--118",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/srikrishnan.html",
  abstract =     "The IBM System z9e and its predecessors pioneered
                 server virtualization, including the sharing of data
                 storage subsystems among the virtual servers of a host
                 computer using the channel- sharing capabilities of
                 FICON channels in Fibre Channel (FC) fabrics. Now
                 industry-standard Small Computer System Interface
                 (SCSI) devices in storage area networks must be shared
                 among host computers using the Fibre Channel Protocol
                 (FCP), and this has been problematic with virtual
                 servers in a host computer. To apply the power of
                 server virtualization to this environment, the IBM
                 System z9 implements a new FC standard called N\_Port
                 Identifier Virtualization (NPIV). IBM invented NPIV and
                 offered it as a standard to enable the sharing of host
                 adapters in IBM servers and FC fabrics. With NPIV, a
                 host FC adapter is shared in such a way that each
                 virtual adapter is assigned to a virtual server and is
                 separately identifiable within the fabric. Connectivity
                 and access privileges within the fabric are controlled
                 by identification of each virtual adapter and, hence,
                 the virtual server using each virtual adapter. This
                 paper describes the problem prior to the development of
                 NPIV, the concept of NPIV, and the first implementation
                 of this technique in the FCP channel of the IBM System
                 z9.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Zee:2007:ISZ,
  author =       "M. Zee and J. W. Stevens and B. L. Thompson and J. A.
                 Fowler and J. Goldman and P. T. Chan and T. P.
                 McSweeney",
  title =        "{IBM System z9} Open Systems Adapter for Communication
                 Controller for {Linux}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "119--130",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/zee.html",
  abstract =     "The IBM 374x Communication Controllers, and the NCP
                 (network control program) software that runs on them,
                 have been at the center of the IBM SNA (Systems Network
                 Architecture) for many years. However, the 374x
                 hardware is no longer being produced. In order to
                 continue to offer IBM customers various functions
                 provided by the NCP product, IBM has developed a
                 Communication Controller for Linux (CCL) for the IBM
                 System z. CCL is a software program that emulates the
                 374x hardware, enabling the NCP to function in Linux.
                 IBM customers now have the ability to migrate their NCP
                 product to a Linux partition on System z. The current
                 NCP product, running on an IBM 374x Communication
                 Controller, supports both host channel and network
                 attachment. The channel protocol used for the
                 host-channel support is referred to as channel data
                 link control (CDLC). In order to provide the System z9e
                 host operating systems with the ability to attach to
                 the new CCL NCP over a channel interface, a new channel
                 adapter is required. The new innovative Open Systems
                 Adapter for NCP (OSN) channel support provided by the
                 OSA-Express2 allows various operating systems on the
                 same System z9 to attach ``internally'' to the CCL
                 without using any external network or channel fabric.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Oakes:2007:ESR,
  author =       "K. J. Oakes and U. Helmich and A. Kohler and A. W.
                 Piechowski and M. Taubert and J. S. Trotter and J. von
                 Buttlar and R. M. {Whalen, Jr.}",
  title =        "Enhanced {I/O} subsystem recovery and availability on
                 the {IBM System z9}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "131--144",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/oakes.html",
  abstract =     "Although part of the IBM System z strategy is to
                 improve design and development processes to prevent
                 errors from escaping to the field, improving recovery
                 is another element in the strategy to keep a machine up
                 and running should an error occur. The z9e continues on
                 an evolutionary path of enhancing I/O subsystem (IOSS)
                 recovery to further advance the reliability,
                 availability, and serviceability (RAS) of System z
                 platforms. This paper presents an overview of recovery
                 and how it interacts with other RAS functions--such as
                 error-detection mechanisms in hardware, including
                 automatic identification and recovery of failing
                 elements--up to the point in time prior to the advent
                 of the z9. It then presents the innovations to IOSS
                 recovery and error detection in the z9 that further
                 improve machine availability. The recovery
                 infrastructure, which significantly reduces recovery
                 time and makes recovery much less dependent on machine
                 scaling for this and future generations of System z
                 servers, is described. Also described are such
                 innovative uses of this new infrastructure as
                 improvements in error detection related to elusive
                 firmware problems seen in prior machines, the ability
                 to detect and recover from firmware hangs or lockups
                 related to inadvertently leaving control blocks locked,
                 and the capability to perform recovery in parallel by
                 multiple system- assist processors.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Mueller:2007:FRC,
  author =       "M. J. Mueller and U. Weiss and T. Webel and L. C.
                 Alves and W. J. Clarke and M. Strasser and E. Engler
                 and G. Cautillo and H. Osterndorf and J. Schulze",
  title =        "Fully redundant clock generation and distribution with
                 dynamic oscillator switchover",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "145--156",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/mueller.html",
  abstract =     "This paper describes a fully redundant clock
                 generation and distribution approach with a fully
                 dynamic switchover capability and concurrent repair. It
                 highlights the challenges as the design evolved from a
                 single source, to a ``cold '' standby backup, and
                 finally to a fully redundant transparent switchover
                 with no interruption of the workloads running on an IBM
                 System z9e. The function split between hardware and the
                 various levels of firmware is described, including the
                 methods to determine the defect component in the clock
                 distribution paths. Finally, we describe the joint
                 effort with a major chip technology vendor to design
                 and develop the necessary circuitry, according to the
                 z9e requirements, for clock synchronization and
                 switching.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Conklin:2007:RPO,
  author =       "C. R. Conklin and C. J. Hollenback and C. Mayer and A.
                 Winter",
  title =        "Reducing planned outages for book hardware maintenance
                 with concurrent book replacement",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "157--171",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/conklin.html",
  abstract =     "The IBM System z9e introduces the enhanced book
                 availability (EBA) feature to reduce the number of
                 planned system outages. Included as part of the EBA
                 feature is the concurrent book replacement (CBR)
                 function, which allows a single book in a multi- book
                 server to be concurrently removed from the system in
                 order for service personnel to perform a repair or to
                 physically upgrade the hardware on the book. This
                 repaired or upgraded book is then concurrently replaced
                 and reintegrated into the server configuration. In this
                 paper, we describe the benefits that the concurrent
                 book replacement function offers a customer during a
                 planned repair or upgrade of the System z9. We also
                 describe a tool, developed to analyze the server in
                 order to determine whether the server is ``prepared''
                 for the concurrent book replacement operation, and we
                 provide an overview of the actions performed by this
                 tool. The paper also contains a description of the
                 concurrent book replacement operation, with an emphasis
                 on the unique functions developed as part of this
                 design.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Helmich:2007:RI,
  author =       "U. Helmich and M. Becht and M. J. Becht and J. R.
                 Easton and R. K. Errickson and T. Gehrmann and S. G.
                 Glassen and S. R. Greenspan and F. Koeble and H.
                 Lehmann and C. Mayer and J. S. Nikfarjam and F. A.
                 Schumacher and W. Storz",
  title =        "Redundant {I/O} interconnect",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "173--184",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/helmich.html",
  abstract =     "The outstanding reliability, availability, and
                 serviceability (RAS) characteristics of IBM mainframe
                 computers are among the features that gained the IBM
                 eServere family its reputation as a leading platform
                 for business-critical applications. The aim now is to
                 further improve IBM System z9t RAS by introducing
                 redundant I/O interconnect (RII) as a building block of
                 enhanced book availability and recovery scenarios. RII
                 provides a means of maintaining I/O connectivity during
                 planned or unplanned outages in a way that is
                 transparent to the operating system and customer
                 applications. The mechanism that meets this requirement
                 is the provision of an alternate path to the I/O cage,
                 which provides high- bandwidth I/O slots to enable a
                 higher number of I/O ports per card. This paper
                 discusses the I/O subsystem hardware and firmware
                 aspects of RII.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Muehlbach:2007:CDU,
  author =       "A. Muehlbach and B. D. Valentine and D. Immel and M.
                 S. Bomar and T. V. Bolan",
  title =        "Concurrent driver upgrade: Method to eliminate
                 scheduled system outages for new function releases",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "185--193",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/muehlbach.html",
  abstract =     "The reliability, availability, and serviceability goal
                 for an IBM zSeries system is to provide
                 24-hour-per-day, 365-day-per-year service with reduced
                 system downtime. The continuous reliable operation rate
                 has been improved with every new zSeries release by
                 using error prevention, error detection, error
                 recovery, and other methods that contribute to avoiding
                 unplanned interruptions. Until now, planned
                 downtime--for example, the time needed to upgrade a
                 zSeries to the next firmware driver--had not yet been
                 addressed. We developed the concurrent driver upgrade
                 (CDU) feature so that customers could add new functions
                 without downtime. It is now possible to upgrade the
                 zSeries firmware engineering change (EC) driver to the
                 next EC level without any performance impact during the
                 upgrade. This paper describes the motivation and
                 strategy of the CDU and describes its use.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Axnix:2007:OSD,
  author =       "C. Axnix and T. Hendel and M. Mueller and A. Nu{\~n}ez
                 Mencias and H. Penner and S. Usenbinz",
  title =        "Open-standard development environment for {IBM System
                 z9} host firmware",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "195--205",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/axnix.html",
  abstract =     "When the PL8 64-bit GNU compiler collection front end
                 was introduced with the IBM z990 system, it laid the
                 foundation to move toward an open-standard development
                 environment for the i390 layer of IBM System z host
                 firmware. However, when the z990 system was developed,
                 the proprietary project development library system and
                 the table of contents object file format for i390 code
                 were still being used. With the IBM System z9e, we have
                 moved to a fully open-standard development environment.
                 This paper describes the steps we took to get there, to
                 improve code performance, development efficiency, and
                 regression testing, and to develop base functionality
                 for important System z9 features such as enhanced
                 driver maintenance. We also discuss plans to further
                 enhance the development environment for future
                 systems.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Theurich:2007:AFV,
  author =       "K. Theurich and A. Albus and F. Eickhoff and D. Immel
                 and A. Kohler and E. Lange and J. von Buttlar",
  title =        "Advanced firmware verification using a code simulator
                 for the {IBM System z9}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "207--216",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/theurich.html",
  abstract =     "Our methods for simulating host firmware of the IBM
                 System z9e facilitated rapid development from first
                 power-on of the system to achieving a platform with a
                 functional operating system. Hundreds of code bugs were
                 eliminated before the code was run on System z9
                 hardware for the first time. This paper describes the
                 methods used in host firmware simulation for early and
                 efficient firmware tests. The central element for
                 firmware simulation is the Central Electronic Complex
                 Simulator (CECSIM), which offers new facilities to
                 manage the hardware of the simulated system. This
                 management includes concurrent configuration changes of
                 processors, memory, and I/O along with the ability to
                 automatically test complex system functions. To verify
                 correct implementation of the z/Architecture, we
                 introduced a new test-case framework called the
                 Verification Interface for System Architecture, or
                 VISA, which is used in simulations as well as on the
                 actual system. All of these features are used
                 separately and in combination. A comprehensive and
                 flexible regression environment ensures periodic
                 execution of the test scenarios, and code path coverage
                 measurements show the degree to which the code was
                 actually verified.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Duale:2007:DFP,
  author =       "A. Y. Duale and M. H. Decker and H.-G. Zipperer and M.
                 Aharoni and T. J. Bohizic",
  title =        "Decimal floating-point in {z9}: An implementation and
                 testing perspective",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "217--227",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/rd.511.0217",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/duale.html",
  abstract =     "Although decimal arithmetic is widely used in
                 commercial and financial applications, the related
                 computations are handled in software. As a result,
                 applications that use decimal data may experience
                 performance degradations. Use of the newly defined
                 decimal floating-point (DFP) format instead of binary
                 floating-point is expected to significantly improve the
                 performance of such applications. System z9 is the
                 first IBM machine to support the DFP instructions. We
                 present an overview of this implementation and provide
                 some measurement of the performance gained using
                 hardware assists. Various tools and techniques employed
                 for the DFP verification on unit, element, and system
                 levels are presented in detail. Several groups within
                 IBM collaborated on the verification of the new DFP
                 facility, using a common reference model to predict DFP
                 results.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Webb:2007:PSR,
  author =       "A. M. Webb and R. Mansell and J. W. Knight and S. J.
                 Greenspan and D. B. Emmes",
  title =        "Practical software reuse for {IBM System z} {I/O}
                 subsystems",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "229--243",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/511/webb.html",
  abstract =     "The design and implementation of the z/VM SCSI (Small
                 Computer System Interface) I/O subsystem is described.
                 z/VM is an operating system that provides multiple
                 virtual IBM System z machines on a single IBM System z
                 computer. The approach adopted herein allows the reuse
                 of entire device drivers from AIX 5Le, a completely
                 different operating system, essentially unchanged. AIX
                 5L is the IBM UNIX operating system for the IBM System
                 pe platform. The design, and much of the implemented
                 code that allows the incorporation of such ``foreign''
                 device drivers, is independent of both z/VM and AIX 5L
                 and could potentially be used in other operating system
                 environments.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Price:2007:MVP,
  author =       "Cyril Price",
  title =        "Message from the {Vice President, System z Program
                 Management, IBM Systems and Technology Group}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "1/2",
  pages =        "??--??",
  month =        jan # "\slash " # mar,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Feb 9 20:31:06 MST 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  ordernumber =  "????",
}

@Article{Schieber:2007:P,
  author =       "B. M. Schieber",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "247--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gresh:2007:ASC,
  author =       "D. L. Gresh and D. P. Connors and J. P. Fasano and R.
                 J. Wittrock",
  title =        "Applying supply chain optimization techniques to
                 workforce planning problems",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "251--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/gresh.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Naveh:2007:WOI,
  author =       "Y. Naveh and Y. Richter and Y. Altshuler and D. L.
                 Gresh and D. P. Connors",
  title =        "Workforce optimization: {Identification} and
                 assignment of professional workers using constraint
                 programming",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "263--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/naveh.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hu:2007:SMA,
  author =       "J. Hu and B. K. Ray and M. Singh",
  title =        "Statistical methods for automated generation of
                 service engagement staffing plans",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "281--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/hu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Muller:2007:QOM,
  author =       "S. M{\"u}ller and C. Supatgiat",
  title =        "A quantitative optimization model for dynamic
                 risk-based compliance management",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "295--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/muller.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yashchin:2007:MRL,
  author =       "E. Yashchin",
  title =        "Modeling of risk losses using size-biased data",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "309--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/yashchin.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vaidyanathan:2007:MNF,
  author =       "B. Vaidyanathan and K. C. Jha and R. K. Ahuja",
  title =        "Multicommodity network flow approach to the railroad
                 crew-scheduling problem",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "325--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/vaidyanathan.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dash:2007:PDP,
  author =       "S. Dash and J. Kalagnanam and C. Reddy and S. H.
                 Song",
  title =        "Production design for plate products in the steel
                 industry",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "345--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/dash.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yanagisawa:2007:MAP,
  author =       "H. Yanagisawa",
  title =        "The material allocation problem in the steel
                 industry",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "363--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/yanagisawa.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Parija:2007:SPP,
  author =       "G. Parija and T. Kumar and H. Xi and D. Keller",
  title =        "Strategic planning of preparedness budgets for
                 wildland fire management",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "375--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/parija.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Barahona:2007:IAT,
  author =       "F. Barahona and P. Chowdhary and M. Ettl and P. Huang
                 and T. Kimbrel and L. Ladanyi and Y. M. Lee and B.
                 Schieber and K. Sourirajan and M. I. Sviridenko and G.
                 M. Swirszcz",
  title =        "Inventory allocation and transportation scheduling for
                 logistics of network-centric military operations",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "391--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/barahona.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Selby:2007:MEO,
  author =       "D. A. Selby",
  title =        "Marketing event optimization",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "409--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/selby.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Labbi:2007:OMP,
  author =       "A. Labbi and C. Berrospi",
  title =        "Optimizing marketing planning and budgeting using
                 {Markov} decision processes: an airline case study",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "421--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/labbi.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Katircioglu:2007:SBC,
  author =       "K. Katircioglu and T. M. Brown and M. Asghar",
  title =        "An {SQL}-based cost-effective inventory optimization
                 solution",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "433--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/katircioglu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Korevaar:2007:IBO,
  author =       "P. Korevaar and U. Schimpel and R. Boedi",
  title =        "Inventory budget optimization: {Meeting} system-wide
                 service levels in practice",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "447--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/korevaar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:2007:IAR,
  author =       "G. F. Anderson and D. A. Selby and M. Ramsey",
  title =        "Insider attack and real-time data mining of user
                 behavior",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "465--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/anderson.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Better:2007:AAI,
  author =       "M. Better and F. Glover and M. Laguna",
  title =        "Advances in analytics: {Integrating} dynamic data
                 mining with simulation optimization",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "477--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/better.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lee:2007:MIN,
  author =       "J. Lee",
  title =        "Mixed-integer nonlinear programming: {Some} modeling
                 and solution issues",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "489--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/lee.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pulleyblank:2007:MVP,
  author =       "William R. Pulleyblank",
  title =        "Message from the {Vice President, Center for Business
                 Optimization}, {IBM} Global Business Services",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "3/4",
  pages =        "??--??",
  month =        apr # "\slash " # may,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:45 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/513/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hofstee:2007:P,
  author =       "H. P. Hofstee and A. K. Nandas and J. J. Ritsko and
                 Editor-in-Chief",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "501--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Johns:2007:ICB,
  author =       "C. R. Johns and D. A. Brokenshire",
  title =        "Introduction to the {Cell Broadband Engine}
                 Architecture",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "503--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/johns.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shimizu:2007:CBE,
  author =       "K. Shimizu and H. P. Hofstee and J. S. Liberty",
  title =        "{Cell Broadband Engine} processor vault security
                 architecture",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "521--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/shimizu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Flachs:2007:MIS,
  author =       "B. Flachs and S. Asano and S. H. Dhong and H. P.
                 Hofstee and G. Gervais and R. Kim and T. Le and P. Liu
                 and J. Leenstra and J. S. Liberty and B. Michael and
                 H.-J. Oh and S. M. Mueller and O. Takahashi and K.
                 Hirairi and A. Kawasumi and H. Murakami and H. Noro and
                 S. Onishi and J. Pille and J. Silberman and S. Yong and
                 A. Hatakeyama and Y. Watanabe and N. Yano and D. A.
                 Brokenshire and M. Peyravian and V. To and E. Iwata",
  title =        "Microarchitecture and implementation of the
                 synergistic processor in 65-nm and 90-nm {SOI}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "529--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/flachs.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Riley:2007:CBE,
  author =       "M. W. Riley and J. D. Warnock and D. F. Wendel",
  title =        "{Cell Broadband Engine} processor: {Design} and
                 implementation",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "545--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/riley.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:2007:CBE,
  author =       "T. Chen and R. Raghavan and J. N. Dale and E. Iwata",
  title =        "{Cell Broadband Engine Architecture} and its first
                 implementation---{A} performance view",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "559--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/chen.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nanda:2007:CBB,
  author =       "A. K. Nanda and J. R. Moulic and R. E. Hanson and G.
                 Goldrian and M. N. Day and B. D. D'Amora and S.
                 Kesavarapu and Karen A. Magerlein and Atman Binstock
                 and Bernard Yee and Francesco Iorio",
  title =        "{Cell\slash B.E.} blades: Building blocks for
                 scalable, real-time, interactive, and digital media
                 servers",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "573--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See erratum \cite{Anonymous:2008:E} supplying missing
                 authors.",
  URL =          "http://www.research.ibm.com/journal/rd/515/nanda.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Liu:2007:SRS,
  author =       "Y. Liu and H. Jones and S. Vaidya and M. Perrone and
                 B. Tydlit{\'a}t and A. K. Nanda",
  title =        "Speech recognition systems on the {Cell Broadband
                 Engine} processor",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "583--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/liu.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Perez:2007:CMI,
  author =       "J. M. Perez and P. Bellens and R. M. Badia and J.
                 Labarta",
  title =        "{CellSs}: Making it easier to program the {Cell
                 Broadband Engine} processor",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "593--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/perez.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Black:2007:PSA,
  author =       "C. T. Black and R. Ruiz and G. Breyta and J. Y. Cheng
                 and M. E. Colburn and K. W. Guarini and H.-C. Kim and
                 Y. Zhang",
  title =        "Polymer self assembly in semiconductor
                 microelectronics",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "5",
  pages =        "605--??",
  month =        sep,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 31 11:53:46 MDT 2007",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/515/black.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mehta:2007:P,
  author =       "H. Mehta",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "637--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Le:2007:IPM,
  author =       "H. Q. Le and W. J. Starke and J. S. Fields and F. P.
                 O'Connell and D. Q. Nguyen and B. J. Ronchetti and W.
                 M. Sauer and E. M. Schwarz and M. T. Vaden",
  title =        "{IBM POWER6} microarchitecture",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "639--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/le.html",
  abstract =     "This paper describes the implementation of the IBM
                 POWER6 microprocessor, a two-way simultaneous
                 multithreaded (SMT) dual-core chip whose key features
                 include binary compatibility with IBM POWER5
                 microprocessor-based systems; increased functional
                 capabilities, such as decimal floating-point and vector
                 multimedia extensions; significant reliability,
                 availability, and serviceability enhancements; and
                 robust scalability with up to 64 physical processors.
                 Based on a new industry-leading high-frequency core
                 architecture with enhanced SMT and driven by a
                 high-throughput symmetric multiprocessing (SMP) cache
                 and memory subsystem, the POWER6 chip achieves a
                 significant performance boost compared with its
                 predecessor, the POWER5 chip. Key extensions to the
                 coherence protocol enable POWER6 microprocessor-based
                 systems to achieve better SMP scalability while
                 enabling reductions in system packaging complexity and
                 cost.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eisen:2007:IPA,
  author =       "L. Eisen and J. W. {Ward III} and H.-W. Tast and N.
                 M{\"a}ding and J. Leenstra and S. M. Mueller and C.
                 Jacobi and J. Preiss and E. M. Schwarz and S. R.
                 Carlough",
  title =        "{IBM POWER6} accelerators: {VMX} and {DFU}",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "663--683",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/eisen.html",
  abstract =     "The IBM POWER6 microprocessor core includes two
                 accelerators for increasing performance of specific
                 workloads. The vector multimedia extension (VMX)
                 provides a vector acceleration of graphic and
                 scientific workloads. It provides single instructions
                 that work on multiple data elements. The instructions
                 separate a 128-bit vector into different components
                 that are operated on concurrently. The decimal
                 floating-point unit (DFU) provides acceleration of
                 commercial workloads, more specifically, financial
                 transactions. It provides a new number system that
                 performs implicit rounding to decimal radix points, a
                 feature essential to monetary transactions. The IBM
                 POWER processor instruction set is substantially
                 expanded with the addition of these two accelerators.
                 The VMX architecture contains 176 instructions, while
                 the DFU architecture adds 54 instructions to the base
                 architecture. The IEEE 754R Binary Floating-Point
                 Arithmetic Standard defines decimal floating-point
                 formats, and the POWER6 processor---on which a
                 substantial amount of area has been devoted to
                 increasing performance of both scientific and
                 commercial workloads---is the first commercial hardware
                 implementation of this format.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "decimal floating-point arithmetic",
}

@Article{Berridge:2007:IPM,
  author =       "R. Berridge and R. M. {Averill III} and A. E. Barish
                 and M. A. Bowen and P. J. Camporese and J. DiLullo and
                 P. E. Dudley and J. Keinert and D. W. Lewis and R. D.
                 Morel and T. Rosser and N. S. Schwartz and P. Shephard
                 and H. H. Smith and D. Thomas and P. J. Restle and J.
                 R. Ripley and S. L. Runyon and P. M. Williams",
  title =        "{IBM POWER6} microprocessor physical design and design
                 methodology",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "685--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/berridge.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Curran:2007:PCH,
  author =       "B. Curran and E. Fluhr and J. Paredes and L. Sigal and
                 J. Friedrich and Y.-H. Chan and C. Hwang",
  title =        "Power-constrained high-frequency circuits for the {IBM
                 POWER6} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "715--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/curran.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Floyd:2007:SPM,
  author =       "M. S. Floyd and S. Ghiasi and T. W. Keller and K.
                 Rajamani and F. L. Rawson and J. C. Rubio and M. S.
                 Ware",
  title =        "System power management support in the {IBM POWER6}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "733--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/floyd.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Plass:2007:IPS,
  author =       "D. W. Plass and Y. H. Chan",
  title =        "{IBM POWER6 SRAM} arrays",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "747--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/plass.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Armstrong:2007:IPP,
  author =       "W. J. Armstrong and R. L. Arndt and T. R. Marchini and
                 N. Nayar and W. M. Sauer",
  title =        "{IBM POWER6} partition mobility: Moving virtual
                 servers seamlessly between physical systems",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "757--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/armstrong.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mack:2007:IPR,
  author =       "M. J. Mack and W. M. Sauer and S. B. Swaney and B. G.
                 Mealey",
  title =        "{IBM POWER6} reliability",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "763--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/mack.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McCreary:2007:EIP,
  author =       "H.-Y. McCreary and M. A. Broyles and M. S. Floyd and
                 A. J. Geissler and S. P. Hartman and F. L. Rawson and
                 T. J. Rosedahl and J. C. Rubio and M. S. Ware",
  title =        "{EnergyScale} for {IBM POWER6} microprocessor-based
                 systems",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "775--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/516/mccreary.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2007:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 51",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "787--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2007:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 51",
  journal =      j-IBM-JRD,
  volume =       "51",
  number =       "6",
  pages =        "795--??",
  month =        nov,
  year =         "2007",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mintzer:2008:P,
  author =       "F. Mintzer",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "3--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Raman:2008:ARP,
  author =       "S. Raman and B. Qian and D. Baker and R. C. Walker",
  title =        "Advances in {Rosetta} protein structure prediction on
                 massively parallel systems",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "7--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/raman.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zhou:2008:MPM,
  author =       "R. Zhou and M. Eleftheriou and C.-C. Hon and R. S.
                 Germain and A. K. Royyuru and B. J. Berne",
  title =        "Massively parallel molecular dynamics simulations of
                 lysozyme unfolding",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "19--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/zhou.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Djurfeldt:2008:BSS,
  author =       "M. Djurfeldt and M. Lundqvist and C. Johansson and M.
                 Rehn and {\"O}. Ekeberg and A. Lansner",
  title =        "Brain-scale simulation of the neocortex on the {IBM
                 Blue Gene/L} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "31--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/djurfeldt.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kozloski:2008:ITA,
  author =       "J. Kozloski and K. Sfyrakis and S. Hill and F.
                 Sch{\"u}rmann and C. Peck and H. Markram",
  title =        "Identifying, tabulating, and analyzing contacts
                 between branched neuron morphologies",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "43--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/kozloski.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shave:2008:LDM,
  author =       "S. R. Shave and P. Taylor and M. Walkinshaw and L.
                 Smith and J. Hardy and A. Trew",
  title =        "Ligand discovery on massively parallel systems",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "57--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/shave.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pang:2008:EIB,
  author =       "Y.-P. Pang and T. J. Mullins and B. A. Swartz and J.
                 S. McAllister and B. E. Smith and C. J. Archer and R.
                 G. Musselman and A. E. Peters and B. P. Wallenfelt and
                 K. W. Pinnow",
  title =        "{EUDOC} on the {IBM Blue Gene/L} system: Accelerating
                 the transfer of drug discoveries from laboratory to
                 patient",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "69--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/pang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Calandra:2008:MPI,
  author =       "H. Calandra and F. Bothorel and P. Vezolle",
  title =        "A massively parallel implementation of the common
                 azimuth pre-stack depth migration",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "83--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/calandra.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Commer:2008:MPE,
  author =       "M. Commer and G. A. Newman and J. J. Carazzone and T.
                 A. Dickens and K. E. Green and L. A. Wahrmund and D. E.
                 Willen and J. Shiu",
  title =        "Massively parallel electrical-conductivity imaging of
                 hydrocarbons using the {IBM Blue Gene/L}
                 supercomputer",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "93--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/commer.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ethier:2008:LSG,
  author =       "S. Ethier and W. M. Tang and R. Walkup and L. Oliker",
  title =        "Large-scale gyrokinetic particle simulation of
                 microturbulence in magnetically confined fusion
                 plasmas",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "105--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/ethier.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dennis:2008:SCS,
  author =       "J. M. Dennis and H. M. Tufo",
  title =        "Scaling climate simulation applications on the {IBM
                 Blue Gene/L} system",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "117--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/dennis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fisher:2008:TTC,
  author =       "R. T. Fisher and L. P. Kadanoff and D. Q. Lamb and A.
                 Dubey and T. Plewa and A. Calder and F. Cattaneo and P.
                 Constantin and I. Foster and M. E. Papka and S. I.
                 Abarzhi and S. M. Asida and P. M. Rich and C. C.
                 Glendenin and K. Antypas and D. J. Sheeler and L. B.
                 Reid and B. Gallagher and S. G. Needham",
  title =        "Terascale turbulence computation using the {FLASH3}
                 application framework on the {IBM Blue Gene/L} system",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "127--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/fisher.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gygi:2008:AQS,
  author =       "F. Gygi",
  title =        "Architecture of {Qbox}: a scalable first-principles
                 molecular dynamics code",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "137--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/gygi.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fitch:2008:BMS,
  author =       "B. G. Fitch and A. Rayshubskiy and M. Eleftheriou and
                 T. J. C. Ward and M. E. Giampapa and M. C. Pitman and
                 J. W. Pitera and W. C. Swope and R. S. Germain",
  title =        "{Blue Matter}: Scaling of {$N$}-body simulations to
                 one atom per node",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "145--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/fitch.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "fast multipole",
}

@Article{Bohm:2008:FGP,
  author =       "E. Bohm and A. Bhatele and L. V. Kal{\'e} and M. E.
                 Tuckerman and S. Kumar and J. A. Gunnels and G. J.
                 Martyna",
  title =        "Fine-grained parallelization of the {Car--Parrinello}
                 ab initio molecular dynamics method on the {IBM Blue
                 Gene/L} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "159--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/bohm.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kumar:2008:SMD,
  author =       "S. Kumar and C. Huang and G. Zheng and E. Bohm and A.
                 Bhatele and J. C. Phillips and H. Yu and L. V.
                 Kal{\'e}",
  title =        "Scalable molecular dynamics with {NAMD} on the {IBM
                 Blue Gene/L} system",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "177--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/kumar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vranas:2008:MPQ,
  author =       "P. Vranas and M. A. Blumrich and D. Chen and A. Gara
                 and M. E. Giampapa and P. Heidelberger and V. Salapura
                 and J. C. Sexton and R. Soltz and G. Bhanot",
  title =        "Massively parallel quantum chromodynamics",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "189--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/vranas.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{IBGT:2008:OIB,
  author =       "{IBM Blue Gene team}",
  title =        "Overview of the {IBM Blue Gene/P Project}",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "199--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/team.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Agerwala:2008:MVP,
  author =       "Tilak Agerwala",
  title =        "Message from the {Vice President, Systems, IBM
                 Research Division}",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "1/2",
  pages =        "??--??",
  month =        jan # "\slash " # mar,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/521/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Heidel:2008:P,
  author =       "D. F. Heidel and J. Hergenrother and K. P. Rodbells",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "223--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Heidel:2008:API,
  author =       "D. F. Heidel and K. P. Rodbell and E. H. Cannon and C.
                 {Cabral, Jr.} and M. S. Gordon and P. Oldiges and H. H.
                 K. Tang",
  title =        "Alpha-particle-induced upsets in advanced {CMOS}
                 circuits and technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "225--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/heidel.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tang:2008:SNG,
  author =       "H. H. K. Tang",
  title =        "{SEMM-2}: a new generation of single-event-effect
                 modeling tools",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "233--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/tang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tang:2008:NSM,
  author =       "H. H. K. Tang and C. E. Murray and G. Fiorenza and K.
                 P. Rodbell and M. S. Gordon and D. F. Heidel",
  title =        "New simulation methodology for effects of radiation in
                 semiconductor chip structures",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "245--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/murray.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{KleinOsowski:2008:CDM,
  author =       "A. KleinOsowski and E. H. Cannon and P. Oldiges and L.
                 Wissel",
  title =        "Circuit design and modeling for soft errors",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "255--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/kleinosowski.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gordon:2008:SEU,
  author =       "M. S. Gordon and K. P. Rodbell and D. F. Heidel and C.
                 {Cabral, Jr.} and E. H. Cannon and D. D. Reinhardt",
  title =        "Single-event-upset and alpha-particle emission rate
                 measurement techniques",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "265--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/gordon.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanda:2008:SER,
  author =       "P. N. Sanda and J. W. Kellington and P. Kudva and R.
                 Kalla and R. B. McBeth and J. Ackaret and R. Lockwood
                 and J. Schumann and C. R. Jones",
  title =        "Soft-error resilience of the {IBM POWER6} processor",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "275--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/sanda.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bender:2008:SER,
  author =       "C. Bender and P. N. Sanda and P. Kudva and R. Mata and
                 V. Pokala and R. Haraden and M. Schallhorn",
  title =        "Soft-error resilience of the {IBM POWER6} processor
                 input\slash output subsystem",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "285--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/bender.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rivers:2008:PPM,
  author =       "J. A. Rivers and P. Bose and P. Kudva and J.-D.
                 Wellman and P. N. Sanda and E. H. Cannon and L. C.
                 Alves",
  title =        "{Phaser}: Phased methodology for modeling the
                 system-level effects of soft errors",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "293--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/rivers.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dell:2008:SRI,
  author =       "T. J. Dell",
  title =        "System {RAS} implications of {DRAM} soft errors",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "307--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/dell.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:2008:MVP,
  author =       "T.-C. Chen",
  title =        "Message from the {Vice President, Science and
                 Technology, IBM Research Division}",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "3",
  pages =        "??--??",
  month =        apr # "\slash " # may,
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jul 7 21:49:07 MDT 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/523/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kandlur:2008:P,
  author =       "Dilip D. Kandlur and Chandrasekhar (Spike) Narayan",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "317--318",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Oehme:2008:ISF,
  author =       "Sven Oehme and Juergen Deicke and Jens-Peter Akelbein
                 and Ronnie Sahlberg and Andred Tridgell and Roger L.
                 Haskin",
  title =        "{IBM Scale out File Services}: Reinventing
                 network-attached storage",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "319--328",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/oehme.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lanjewar:2008:GAF,
  author =       "Ujjwal Lanjewar and Manoj Naik and Renu Tewari",
  title =        "{Glamor}: An architecture for file system federation",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "329--339",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/lanjewar.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gopisetty:2008:ESM,
  author =       "Sandeep Gopisetty and Sandip Agarwala and Eric Butler
                 and Divyesh Jadav and Stefan Jaquet and Madhukar
                 Korupolu and Ramani Routray and Prasenjit Sarkar and
                 Aameek Singh and Miriam Sivan-Zimet and Chung-Hao Tan
                 and Sandeep Uttamchandani and David Merbach and Sumant
                 Padbidri and Andreas Dieberger and Eben M. Haber and
                 Eser Kandogan and Cheryl A. Kieliszewski and Dakshi
                 Agrawal and Murthy Devarakonda and Kang-Wong Lee and
                 Kostas Magoutis and Dinesh C. Verma and Norbert G.
                 Vogl",
  title =        "Evolution of storage management: Transforming raw data
                 into information",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "341--352",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/gopisetty.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gopisetty:2008:APS,
  author =       "Sandeep Gopisetty and Eric Butler and Stefan Jaquet
                 and Madhukar Korupolu and Tapan K. Nayak and Ramani
                 Routray and Mark Seaman and Aameek Singh and Chung-Hao
                 Tan and Sandeep Uttamchandani and Akshat Verma",
  title =        "Automated planners for storage provisioning and
                 disaster recovery",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "353--365",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/butler.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Magoutis:2008:GMD,
  author =       "Kostas Magoutis and Murthy Devarakonda and Nikolai
                 Joukov and Norbert G. Vogl",
  title =        "{Galapagos}: Model-driven discovery of end-to-end
                 application--storage relationships in distributed
                 systems",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "367--377",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/magoutis.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bradshaw:2008:ASS,
  author =       "Paul L. Bradshaw and Karen W. Brannon and Thomas Clark
                 and Kirby Dahman and Sangeeta Doraiswamy and Linda
                 Duyanovich and Bruce L. Hillsberg and Wayne Hineman and
                 Michael Kaczmarski and Bernhard J. (BJ) Klingenberg and
                 Xiaonan Ma and Robert Rees",
  title =        "Archive storage system design for long-term storage of
                 massive amounts of data",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "379--388",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/bradshaw.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rabinovici-Cohen:2008:PDN,
  author =       "Simona Rabinovici-Cohen and Michael E. Factor and
                 Dalit Naor and Leeat Ramati and Petra Reshef and Shahar
                 Ronen and Julian Satran and David L. Giaretta",
  title =        "{Preservation DataStores}: New storage paradigm for
                 preservation environments",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "389--399",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/rabinovici.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nagle:2008:ATO,
  author =       "David Nagle and Michael E. Factor and Sami Iren and
                 Dalit Naor and Erik Riedel and Ohad Rodeh and Julian
                 Satran",
  title =        "The {ANSI T10} object-based storage standard and
                 current implementations",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "401--411",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/nagle.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hafner:2008:UDE,
  author =       "James L. Hafner and Veera Deenadhayalan and Wendy
                 Belluomini and Krishnakumar Rao",
  title =        "Undetected disk errors in {RAID} arrays",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "413--425",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/hafner.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chambliss:2008:ASH,
  author =       "David Chambliss and Prashant Pandey and Tarun Thakur
                 and Aki Fleshler and Thomas Clark and James A. Ruddy
                 and Kevin D. Gougherty and Matt Kalos and Lyle Merithew
                 and John G. Thompson and Harry M. Yudenfriend",
  title =        "An architecture for storage-hosted application
                 extensions",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "427--437",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/chambliss.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Freitas:2008:SCM,
  author =       "Richard F. Freitas and Winfried W. Wilcke",
  title =        "Storage-class memory: The next storage system
                 technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "439--447",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/freitas.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Burr:2008:OCD,
  author =       "Geoffrey W. Burr and B{\"u}lent N. Kurdi and J.
                 Campbell Scott and Chung H. Lam and Kailash
                 Gopalakrishnan and Rohit S. Shenoy",
  title =        "Overview of candidate device technologies for
                 storage-class memory",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "449--464",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/burr.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Raoux:2008:PCR,
  author =       "Simone Raoux and Geoffrey W. Burr and Matthew J.
                 Breitwisch and Charles T. Rettner and Yi-Chou Chen and
                 Robert M. Shelby and Martin Salinga and Daniel Krebs
                 and Shih-Hung Chen and Hsiang-Lan Lung and Chung H.
                 Lam",
  title =        "Phase-change random access memory: a scalable
                 technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "465--479",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/raoux.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Karg:2008:TMO,
  author =       "Siegfried F. Karg and G. Ingmar Meijer and J. Georg
                 Bednorz and Charles T. Rettner and Alejandro G. Schrott
                 and Eric A. Joseph and Chung H. Lam and Markus Janousch
                 and Urs Staub and Fabio {La Mattina} and Santos F.
                 Alvarado and Daniel Widmer and Richard Stutz and Ute
                 Drechsler and Daniele Caimi",
  title =        "Transition-metal-oxide-based resistance-change
                 memories",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "481--492",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/karg.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pantazi:2008:PBU,
  author =       "A. Pantazi and A. Sebastian and T. A. Antonakopoulos
                 and P. B{\"a}chtold and A. R. Bonaccio and J. Bonan and
                 G. Cherubini and M. Despont and R. A. DiPietro and U.
                 Drechsler and U. D{\"u}rig and B. Gotsmann and W.
                 H{\"a}berle and C. Hagleitner and J. L. Hedrick and D.
                 Jubin and A. Knoll and M. A. Lantz and J. Pentarakis
                 and H. Pozidis and R. C. Pratt and H. Rothuizen and R.
                 Stutz and M. Varsamou and D. Wiesmann and E.
                 Eleftheriou",
  title =        "Probe-based ultrahigh-density storage technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "493--511",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/pantazi.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Argumedo:2008:STR,
  author =       "Armando J. Argumedo and David Berman and Robert G.
                 Biskeborn and Giovanni Cherubini and Roy D. Cideciyan
                 and Evangelos Eleftheriou and Walter H{\"a}berle and
                 Diana J. Hellman and Robert Hutchins and Wayne Imaino
                 and Jens Jelitto and Kevin Judd and Pierre-Olivier
                 Jubert and Mark A. Lantz and Gary M. McClelland and
                 Thomas Mittelholzer and Chandrasekhar (Spike) Narayan
                 and Sedat {\"O}l{\c{c}}er and Paul J. Seger",
  title =        "Scaling tape-recording areal densities to {100
                 Gb/in$^2$}",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "513--527",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/argumedo.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lai:2008:FMS,
  author =       "Stefan K. Lai",
  title =        "Flash memories: Successes and challenges",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "529--435",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/lai.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dean:2008:MVP,
  author =       "Mark E. Dean and Barry Rudolph",
  title =        "Message from the {Vice President, Technical Strategy
                 and Global Operations, IBM Research} and the {Vice
                 President, System Storage, IBM Systems and Technology
                 Group}",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "4/5",
  pages =        "",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/524/message.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Knickerbocker:2008:P,
  author =       "John U. Knickerbocker",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "539--540",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Emma:2008:CTN,
  author =       "Philip G. Emma and Eren Kursun",
  title =        "Is {$3$D} chip technology the next growth engine for
                 performance improvement?",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "541--552",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/emma.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Knickerbocker:2008:TDS,
  author =       "John U. Knickerbocker and Paul S. Andry and Bing Dang
                 and Raymond R. Horton and Mario J. Interrante and
                 Chirag S. Patel and Robert J. Polastre and Katsuyuki
                 Sakuma and Ranjani Sirdeshmukh and Edmund J. Sprogis
                 and Sri M. Sri-Jayantha and Antonio M. Stephens and
                 Anna W. Topol and Cornelia K. Tsang and Bucknell C.
                 Webb and Steven L. Wright",
  title =        "Three-dimensional silicon integration",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "553--569",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/knickerbocker.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andry:2008:FCR,
  author =       "Paul S. Andry and Cornelia K. Tsang and Bucknell C.
                 Webb and Edmund J. Sprogis and Steven L. Wright and
                 Bing Dang and Dennis G. Manzer",
  title =        "Fabrication and characterization of robust
                 through-silicon vias for silicon-carrier applications",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "571--581",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/andry.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koester:2008:WLI,
  author =       "Steven J. Koester and Albert M. Young and Roy R. Yu
                 and Sampath Purushothaman and Kuan-Neng Chen and
                 Douglas C. {La Tulipe, Jr.} and Narender Rana and
                 Leathen Shi and Matthew R. Wordeman and Edmund J.
                 Sprogis",
  title =        "Wafer-level {$3$D} integration technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "583--597",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/koester.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dang:2008:CSC,
  author =       "Bing Dang and Steven L. Wright and Paul S. Andry and
                 Edmund J. Sprogis and Cornelia K. Tsang and Mario J.
                 Interrante and Bucknell C. Webb and Robert J. Polastre
                 and Raymond R. Horton and Chirag S. Patel and Arun
                 Sharma and Jiantao Zheng and Katsuyuki Sakuma and John
                 U. Knickerbocker",
  title =        "{$3$D} chip stacking with {C4} technology",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "599--609",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/dang.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sakuma:2008:CST,
  author =       "Katsuyuki Sakuma and Paul S. Andry and Cornelia K.
                 Tsang and Steven L. Wright and Bing Dang and Chirag S.
                 Patel and Bucknell C. Webb and Joana Maria and Edmund
                 J. Sprogis and Sung K. Kang and Robert J. Polastre and
                 Raymond R. Horton and John U. Knickerbocker",
  title =        "{$3$D} chip-stacking technology with through-silicon
                 vias and low-volume lead-free interconnections",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "611--622",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/sakuma.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sri-Jayantha:2008:TME,
  author =       "Sri M. Sri-Jayantha and Gerard McVicker and Kerry
                 Bernstein and John U. Knickerbocker",
  title =        "Thermomechanical modeling of {$3$D} electronic
                 packages",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "623--634",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/sri-jayantha.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Joseph:2008:TSV,
  author =       "Alvin J. Joseph and John D. Gillis and Mark Doherty
                 and Peter J. Lindgren and Rosemary A. Previti-Kelly and
                 Ramana M. Malladi and Ping-Chuan Wang and Mete Erturk
                 and Hanyi Ding and Ephrem G. Gebreselasie and Michael
                 J. McPartlin and James Dunn",
  title =        "Through-silicon vias enable next-generation {SiGe}
                 power amplifiers for wireless communications",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "635--648",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/joseph.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2008:AIV,
  author =       "Anonymous",
  title =        "Author index for Volume 52",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "649--655",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/authv52.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2008:SIV,
  author =       "Anonymous",
  title =        "Subject index for Volume 52",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "657--661",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/526/subjv52.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2008:E,
  author =       "Anonymous",
  title =        "Erratum",
  journal =      j-IBM-JRD,
  volume =       "52",
  number =       "6",
  pages =        "663--663",
  month =        "????",
  year =         "2008",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Nov 26 16:33:43 MST 2008",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  note =         "See \cite{Nanda:2007:CBB}.",
  URL =          "http://www.research.ibm.com/journal/rd/526/erratum.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McPherson:2009:P,
  author =       "Tom McPherson and Robert Wallners",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "i--i",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/preface.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Price:2009:MVP,
  author =       "Cyril Price and Carla Shultis",
  title =        "Message from the {Vice President, System Z Program
                 Management} and the {Vice President, System Z Operating
                 System Development}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "1--3",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/message.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shum:2009:DMI,
  author =       "C.-L. K. Shum and F. Busaba and S. Dao-Trong and G.
                 Gerwig and C. Jacobi and T. Koehler and E. Pfeffer and
                 B. R. Prasky and J. G. Rell and A. Tsai",
  title =        "Design and microarchitecture of the {IBM System z10}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "1:1--1:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/shum.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mak:2009:ISZ,
  author =       "P. Mak and C. R. Walters and G. E. Strait",
  title =        "{IBM System z10} processor cache subsystem
                 microarchitecture",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "2:1--2:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/mak.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Krygowski:2009:FVI,
  author =       "C. A. Krygowski and D. G. Bair and R. M. Gott and M.
                 H. Decker and A. V. Giri and C. Habermann and M.
                 Heizmann and S. Letz and W. J. Lewis and S. M. Licker
                 and H. Mallar and E. C. McCain and W. Roesner and N.
                 Siddique and A. E. Seigler and B. W. Thompto and K.
                 Weber and R. Winkelmann",
  title =        "Functional verification of the {IBM System z10}
                 processor chipset",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "3:1--3:11",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/krygowski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schwarz:2009:DFP,
  author =       "E. M. Schwarz and J. S. Kapernick and M. F.
                 Cowlishaw",
  title =        "Decimal floating-point support on the {IBM System z10}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "4:1--4:10",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/schwarz.pdf",
  abstract =     "The latest IBM zSeries processor, the IBM System z10
                 processor, provides hardware support for the decimal
                 floating-point (DFP) facility that was introduced on
                 the IBM System z9 processor. The z9 processor
                 implements the facility with a mixture of low-level
                 software and hardware assists. Recently, the IBM POWER6
                 processor-based System p 570 server introduced a
                 hardware implementation of the DFP facility. The latest
                 zSeries processor includes a decimal floating-point
                 unit based on the POWER6 processor DFP unit that has
                 been enhanced to also support the traditional zSeries
                 decimal fixed-point instruction set. This paper
                 explains the hardware implementation to support both
                 decimal fixed point and DFP and the new software
                 support for the DFP facility, including IBM z/OS, Java
                 JIT, and C/C++ compilers, as well as support in IBM DB2
                 and middleware.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Salem:2009:SFT,
  author =       "G. Salem and D. W. Wittig and T. G. Foote and B. J.
                 Robbins and C. Hirko and D. O. Forlenza and F. Motika
                 and J. A. Kyle and M. P. Kusko and O. P. Forlenza and
                 R. J. Frishmuth and R. Yaari and S. Michnowski and U.
                 Baur",
  title =        "Structural and functional test of {IBM System z10}
                 chips",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "5:1--5:11",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/salem.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chencinski:2009:ISZ,
  author =       "E. W. Chencinski and M. A. Check and C. DeCusatis and
                 H. Deng and M. Grassi and T. A. Gregg and M. M. Helms
                 and A. D. Koenig and L. Mohr and K. Pandey and T.
                 Schlipf and T. Schober and H. Ulrich and C. R.
                 Walters",
  title =        "{IBM System z10} {I/O} subsystem",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "6:1--6:13",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/chencinski.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schlipf:2009:DVI,
  author =       "T. Schlipf and M. M. Helms and J. Ruf and M. Klein and
                 R. Dorsch and B. Hoppe and W. Lipponer and S. Boekholt
                 and T. R{\"o}wer and M. Walz and S. Junghans",
  title =        "Design and verification of the {IBM System z10} {I/O}
                 subsystem chips",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "7:1--7:11",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/schlipf.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haynie:2009:ISZ,
  author =       "H. M. Haynie and J. M. Turner and J. C. Hanscom and M.
                 {Cadigan, Jr.} and N. Hadzic and D. Di Genova and J.
                 Aylward and S. W. Salisbury and P. Sciuto and T. D.
                 Needham and C. E. Bubb and R. B. Tremaine",
  title =        "{IBM System z10} Open Systems Adapter {Ethernet} data
                 router",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "8:1--8:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/haynie.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Torok:2009:PDI,
  author =       "J. G. Torok and F. E. Bosco and W. L. Brodsky and E.
                 F. Furey and G. F. Goth and D. J. Kearney and J. J.
                 Loparco and M. T. Peets and K. L. Pizzolato and D. W.
                 Porter and G. Ruehle and W. H. White",
  title =        "Packaging design of the {IBM System z10} Enterprise
                 Class platform central electronic complex",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "9:1--9:15",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/torok.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Winkel:2009:PDC,
  author =       "T.-M. Winkel and H. Harrer and D. Kaller and J. Supper
                 and D. M. Dreps and K. L. Christian and D. Cosmadelis
                 and T. Zhou and T. Strach and J. Ludwig and D. L.
                 Edwards",
  title =        "Packaging design challenges of the {IBM System z10}
                 Enterprise Class server",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "10:1--10:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/winkel.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Clarke:2009:ISZ,
  author =       "W. J. Clarke and L. C. Alves and T. J. Dell and H.
                 Elfering and J. P. Kubala and C. Lin and M. J. Mueller
                 and K. Werner",
  title =        "{IBM System z10} design for {RAS}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "11:1--11:13",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/clarke.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koerner:2009:ISZ,
  author =       "S. Koerner and A. Kohler and J. Babinsky and H. Pape
                 and F. Eickhoff and S. Kriese and H. Elfering",
  title =        "{IBM System z10} firmware simulation",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "12:1--12:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/koerner.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mathias:2009:ACI,
  author =       "T. B. Mathias and P. J. Callaghan",
  title =        "Autonomic computing and {IBM System z10} active
                 resource monitoring",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "13:1--13:11",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/mathias.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bieswanger:2009:PTM,
  author =       "A. Bieswanger and M. Andres and J. J. {Van Heuklon}
                 and T. B. Mathias and H. Osterndorf and S. A. Piper and
                 M. R. Vanderwiel",
  title =        "Power and thermal monitoring for the {IBM System
                 z10}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "14:9--14:9",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/bieswanger.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Axnix:2009:CDA,
  author =       "C. Axnix and J. R. Birtles and M. Groetzner and F.
                 Hardt and K.-J. Kuehl and V. M. Lourenco and C. Mayer
                 and J. Probst and H. Sinram and M. Stock and B. D.
                 Valentine",
  title =        "Capacity on Demand advancements on the {IBM System
                 z10}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "15:1--15:12",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/axnix.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jackson:2009:ISZ,
  author =       "K. M. Jackson and M. A. Wisniewski and D. Schmidt and
                 U. Hild and S. Heisig and P. C. Yeh and W. Gellerich",
  title =        "{IBM System z10} performance improvements with
                 software and hardware synergy",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "16:1--16:8",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/jackson.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tzortzatos:2009:ISZ,
  author =       "E. Tzortzatos and J. Bartik and P. Sutton",
  title =        "{IBM System z10} support for large pages",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "1",
  pages =        "17:1--17:8",
  month =        jan # "\slash " # feb,
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 14:25:32 MST 2009",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/rd/531/tzortzatos.pdf",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bertino:2009:APS,
  author =       "E. Bertino and C. Brodie and S. B. Calo and L. F.
                 Cranor and C. Karat and J. Karat and N. Li and D. Lin
                 and J. Lobo and Q. Ni and P. R. Rao and X. Wang",
  title =        "Analysis of privacy and security policies",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/bertino.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Birman:2009:P,
  author =       "Alex Birman and John J. Ritsko",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chapin:2009:TPW,
  author =       "D. A. Chapin and A. C. Nelson and B. S. Gerber",
  title =        "A technology perspective on worldwide privacy
                 regulations",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/chapin.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hennessy:2009:DCS,
  author =       "S. D. Hennessy and G. D. Lauer and N. Zunic and B.
                 Gerber and A. C. Nelson",
  title =        "Data-centric security: Integrating data privacy and
                 data security",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/hennessy.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Karat:2009:PFS,
  author =       "J. Karat and C.-M. Karat and E. Bertino and N. Li and
                 Q. Ni and C. Brodie and J. Lobo and S. B. Calo and L.
                 F. Cranor and P. Kumaraguru and R. W. Reeder",
  title =        "Policy framework for security and privacy management",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/karat.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Karger:2009:PES,
  author =       "P. A. Karger and G. S. Kc and D. C. Toll",
  title =        "Privacy is essential for secure mobile devices",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/karger.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pearson:2009:MVP,
  author =       "Harriet P. Pearson",
  title =        "Message from the {Vice President, Regulatory Policy
                 {\&} Chief Privacy Officer}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/letter.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pfleeger:2009:HPS,
  author =       "S. L. Pfleeger and C. P. Pfleeger",
  title =        "Harmonizing privacy with security principles and
                 practices",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/pfleeger.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Renegar:2009:PVC,
  author =       "B. D. Renegar and K. Michael",
  title =        "Privacy-value-control harmonization for {RFID}
                 adoption in retail",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/renegar.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seshadri:2009:RSR,
  author =       "S. Seshadri and L. Liu and L. Chiu",
  title =        "Recovery scopes, recovery groups, and fine-grained
                 recovery in enterprise storage controllers with
                 multi-core processors",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/seshadri.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Viecco:2009:PAA,
  author =       "C. Viecco and A. Tsow and L. J. Camp",
  title =        "A privacy-aware architecture for a {Web} rating
                 system",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/532/viecco.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Brunschwiler:2009:TZE,
  author =       "T. Brunschwiler and B. Smith and E. Ruetsche and B.
                 Michel",
  title =        "Toward zero-emission data centers through direct reuse
                 of thermal energy",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/brunschwiler.html",
  acknowledgement = ack-nhfb,
  articleno =    "11",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bunn:2009:EEB,
  author =       "S. M. Bunn and L. Reynolds",
  title =        "The energy-efficiency benefits of pump-scheduling
                 optimization for potable water supplies",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/bunn.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen-Ritzo:2009:IP,
  author =       "C.-H. Chen-Ritzo and C. Harrison and J. Paraszczak and
                 F. Parr",
  title =        "Instrumenting the planet",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/chen-ritzo.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eckman:2009:ISQ,
  author =       "B. Eckman and P. C. West and C. Barford and G. Raber",
  title =        "Intuitive simulation, querying, and visualization for
                 river basin policy and management",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/eckman.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hamann:2009:UEE,
  author =       "H. F. Hamann and T. G. van Kessel and M. Iyengar and
                 J.-Y. Chung and W. Hirt and M. A. Schappert and A.
                 Claassen and J. M. Cook and W. Min and Y. Amemiya and
                 V. L{\'o}pez and J. A. Lacey and M. O'Boyle",
  title =        "Uncovering energy-efficiency opportunities in data
                 centers",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/hamann.html",
  acknowledgement = ack-nhfb,
  articleno =    "10",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kolar:2009:CRT,
  author =       "H. R. Kolar and J. Cronin and P. Hartswick and A. C.
                 Sanderson and J. S. Bonner and L. Hotaling and R. F.
                 Ambrosio and Z. Liu and M. L. Passow and M. L. Reath",
  title =        "Complex real-time environmental monitoring of the
                 {Hudson River} and estuary system",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/kolar.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nunes:2009:MVP,
  author =       "Sharon Nunes",
  title =        "Message from the {Vice President, Strategic Growth
                 Initiatives, Big Green Innovations, {IBM} Systems {\&}
                 Technology Group}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/letter.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{OHare:2009:AED,
  author =       "G. M. P. O'Hare and D. Diamond and K. T. Lau and J.
                 Hayes and C. Muldoon and M. J. O'Grady and R. Tynan and
                 G. Rancourt and H. R. Kolar and R. J. McCarthy",
  title =        "The adaptive environment: Delivering the vision of in
                 situ real-time environmental monitoring",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/ohare.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Olson:2009:GST,
  author =       "E. G. Olson and N. Brady",
  title =        "{Green Sigma} and the technology of transformation for
                 environmental stewardship",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/olson.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reason:2009:AIF,
  author =       "J. M. Reason and R. Crepaldi",
  title =        "Ambient intelligence for freight railroads",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/reason.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schmidt:2009:TIT,
  author =       "R. Schmidt and M. Iyengar",
  title =        "Thermodynamics of information technology data
                 centers",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/schmidt.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sourirajan:2009:CMA,
  author =       "K. Sourirajan and P. Centonze and M. E. Helander and
                 K. Katircioglu and M. Ben-Hamida and C. Boucher",
  title =        "Carbon management in assembly manufacturing
                 logistics",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/sourirajan.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Srinivasan:2009:TIW,
  author =       "K. Srinivasan and S. Goyal and T. Siegmund and G.
                 Subbarayan and Q. Lin",
  title =        "Thermally induced wrinkling in thin-film stacks on
                 patterned substrates",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/srinivasan.html",
  acknowledgement = ack-nhfb,
  articleno =    "12",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Williams:2009:P,
  author =       "R. Peter Williams",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "3",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:13 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/533/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Adeshiyan:2009:UVH,
  author =       "T. Adeshiyan and C. R. Attanasio and E. M. Farr and R.
                 E. Harper and D. Pelleg and C. Schulz and L. F.
                 Spainhower and P. Ta-Shma and L. A. Tomek",
  title =        "Using virtualization for high availability and
                 disaster recovery",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/adeshiyan.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Appavoo:2009:KEC,
  author =       "J. Appavoo and V. Uhlig and A. Waterland and B.
                 Rosenburg and D. Da Silva and J. E. Moreira",
  title =        "{Kittyhawk}: Enabling cooperation and competition in a
                 global, shared computational system",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/appavoo.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berger:2009:SCI,
  author =       "S. Berger and R. C{\'a}ceres and K. Goldman and D.
                 Pendarakis and R. Perez and J. R. Rao and E. Rom and R.
                 Sailer and W. Schildhauer and D. Srinivasan and S. Tal
                 and E. Valdez",
  title =        "Security for the cloud infrastructure: Trusted virtual
                 data center implementation",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/berger.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Breiter:2009:LCC,
  author =       "G. Breiter and M. Behrendt",
  title =        "Life cycle and characteristics of services in the
                 world of cloud computing",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/breiter.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jin:2009:RVA,
  author =       "X. Jin and R. Willenborg and Y. Zhao and C. Sun and L.
                 He and Z. Chen and Y. Chen and Q. Wang",
  title =        "Reinventing virtual appliances",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/jin.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Naghshineh:2009:IRD,
  author =       "M. Naghshineh and R. Ratnaparkhi and D. Dillenberger
                 and J. R. Doran and C. Dorai and L. Anderson and G.
                 Pacifici and J. L. Snowdon and A. Azagury and M.
                 VanderWiele and Y. Wolfsthal",
  title =        "{IBM Research Division} cloud computing initiative",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/naghshineh.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Neogi:2009:BFB,
  author =       "A. Neogi and A. Mohindra and B. Viswanathan and T.
                 Kushida and H. Horii",
  title =        "{BlueStar}: a federation-based approach to building
                 {Internet}-scale data centers",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/neogi.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rochwerger:2009:RMA,
  author =       "B. Rochwerger and D. Breitgand and E. Levy and A.
                 Galis and K. Nagin and I. M. Llorente and R. Montero
                 and Y. Wolfsthal and E. Elmroth and J. C{\'a}ceres and
                 M. Ben-Yehuda and W. Emmerich and F. Gal{\'a}n",
  title =        "The {Reservoir} model and architecture for open
                 federated cloud computing",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/rochwerger.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Silva:2009:SDC,
  author =       "M. Silva and M. Banikazemi and M. Butrico and D. Daly
                 and S. Guthridge and J. E. Moreira and W. V. Ruggiero",
  title =        "Scalable data center provisioning and control",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/silva.html",
  acknowledgement = ack-nhfb,
  articleno =    "10",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:2009:P,
  author =       "T. Basil Smith and M. Naghshineh and N. Bowen and P.
                 Gupta and K. Schultzs",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vouk:2009:UVT,
  author =       "M. A. Vouk and A. Rindos and S. F. Averitt and J. Bass
                 and M. Bugaev and A. Kurth and A. Peeler and H. E.
                 Schaffer and E. D. Sills and S. Stein and J. Thompson
                 and M. Valenzisi",
  title =        "Using {VCL} technology to implement distributed
                 reconfigurable data centers and computational services
                 for educational institutions",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "4",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/534/vouk.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Biberstein:2009:CBE,
  author =       "M. Biberstein and S. Dori-Hacohen and Y. Harel and A.
                 Heilper and B. Mendelson and U. Shvadron and E.
                 Treister and J. Turek and M. S. Chang",
  title =        "{Cell Broadband Engine} processor performance
                 optimization: Tracing tools implementation and use",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/biberstein.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cohen:2009:AAO,
  author =       "D. Cohen and F. Petrini and M. D. Day and M.
                 Ben-Yehuda and S. W. Hunter and U. Cummings",
  title =        "Applying {Amdahl's Other Law} to the data center",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/cohen-hunter.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Crawford:2009:SAS,
  author =       "C. H. Crawford and D. J. Burdick and J. N. Dale and E.
                 F. Ford and R. A. Mikosh and A. Nobles and V. To",
  title =        "Software architecture and system validation of an
                 open, unified model for accelerated multicore
                 computing",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/crawford.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Grice:2009:BPB,
  author =       "D. Grice and H. Brandt and C. Wright and P. McCarthy
                 and A. Emerich and T. Schimke and C. Archer and J.
                 Carey and P. Sanders and J. A. Fritzjunker and S. Lewis
                 and P. Germann",
  title =        "Breaking the petaflops barrier",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/grice.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gschwind:2009:IEP,
  author =       "M. Gschwind",
  title =        "Integrated execution: a programming model for
                 accelerators",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/gschwind.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gschwind:2009:P,
  author =       "M. Gschwind and M. Perrones",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kistler:2009:PLB,
  author =       "M. Kistler and J. Gunnels and D. Brokenshire and B.
                 Benton",
  title =        "Programming the {Linpack} benchmark for {Roadrunner}",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/kistler.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pakin:2009:RAM,
  author =       "S. Pakin and M. Lang and D. J. Kerbyson",
  title =        "The reverse-acceleration model for programming
                 petascale hybrid systems",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/pakin-kerbyson.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Penner:2009:DHS,
  author =       "H. Penner and U. Bacher and J. Kunigk and C. Rund and
                 H. J. Schick",
  title =        "{directCell}: Hybrid systems with tightly coupled
                 accelerators",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/penner.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rohrer:2009:ANR,
  author =       "J. Rohrer and L. Gong",
  title =        "Accelerating {$3$D} nonrigid registration using the
                 {Cell Broadband Engine} processor",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/rohrer.html",
  acknowledgement = ack-nhfb,
  articleno =    "12",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vogt:2009:IBQ,
  author =       "J.-S. Vogt and R. Land and H. Boettiger and Z.
                 Krnjajic and H. Baier",
  title =        "{IBM BladeCenter QS22}: Design, performance, and
                 utilization in hybrid computing systems",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "5",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/535/vogt.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Banavar:2009:P,
  author =       "G. Banavar and D. Saha and C. Dorais",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bhamidipaty:2009:IIQ,
  author =       "A. Bhamidipaty and N. C. Narendra and S. Nagar and V.
                 K. Varshneya and M. Vasa and C. Deshwal",
  title =        "{Indra}: An integrated quantitative system for
                 compliance management for {IT} service delivery",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/bhamidipaty.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bhide:2009:CFS,
  author =       "M. Bhide and S. Negi and L. V. Subramaniam and H.
                 Gupta",
  title =        "Customer-focused service management for contact
                 centers",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/bhide.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Black:2009:ATG,
  author =       "J. Black and R. Gottschalk and T. Lococo and D.
                 Moore",
  title =        "Architectures and technologies for the globally
                 integrated enterprise",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/black.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chang:2009:GIH,
  author =       "R. N. Chang and W. Falk and H. Hall and P. Kopp and S.
                 Pappe and M. Schultz and A. Szypka and N. C. Wadia",
  title =        "Gaining insight into the health of {SOA}
                 infrastructures",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/chang-falk.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jamjoom:2009:CSD,
  author =       "H. Jamjoom and H. Qu and M. J. Buco and M. Hernandez
                 and D. Saha and M. Naghshineh",
  title =        "Crowdsourcing and service delivery",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/jamjoom.html",
  acknowledgement = ack-nhfb,
  articleno =    "12",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Khan:2009:AHF,
  author =       "A. Khan and H. Jamjoom and J. Sun",
  title =        "{AIM-HI}: a framework for request routing in
                 large-scale {IT} global service delivery",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/khan-jamjoom.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lenchner:2009:SDP,
  author =       "J. Lenchner and D. Rosu and N. F. Velasquez and S. Guo
                 and K. Christiance and D. DeFelice and P. M. Deshpande
                 and K. Kummamuru and N. Kraus and L. Z. Luan and D.
                 Majumdar and M. McLaughlin and S. Ofek-Koifman and
                 Deepak P. and C.-S. Perng and H. Roitman and C. Ward
                 and J. Young",
  title =        "A service delivery platform for server management
                 services",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/lenchner-rosu.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tagg:2009:ISC,
  author =       "B. S. Tagg",
  title =        "The {IBM Services Connection}: Service delivery
                 through self-service portal technologies",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/tagg.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Viswanathan:2009:EDD,
  author =       "M. Viswanathan and H. Shaikh and A. Sailer and Y. Song
                 and X. Fang and Y. H. Wu and Z. L. Zou and K. P. Reddy
                 and A. Deshmukh and M. Gupta and B. Krishnamurthy and
                 M. Sethi and B. Viswanathan and J. G. Gulla and F.
                 Matar",
  title =        "{ERMIS}: Designing, developing, and delivering a
                 remote managed infrastructure services solution",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/viswanathan-shaikh.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ward:2009:TTB,
  author =       "C. Ward and S. Agassi and K. Bhattacharya and O. Biran
                 and R. Cocchiara and M. E. Factor and C. T. Hayashi and
                 T. Hochberg and B. Kearney and J. Laredo and D.
                 Loewenstern and A. E. Rodecap and J. K. Skoog and L.
                 Shwartz and M. Thompson and R. Thompson and Y.
                 Wolfsthal",
  title =        "Toward transforming business continuity services",
  journal =      j-IBM-JRD,
  volume =       "53",
  number =       "6",
  pages =        "??--??",
  month =        "????",
  year =         "2009",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/536/ward.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chetlur:2010:SWM,
  author =       "M. Chetlur and U. Devi and P. Dutta and P. Gupta and
                 L. Chen and Z. Zhu and S. Kalyanaraman and Y. Lin",
  title =        "A software {WiMAX} medium access control layer using
                 massively multithreaded processors",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/chetlur-dutta.html",
  acknowledgement = ack-nhfb,
  articleno =    "9",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Franke:2010:EHM,
  author =       "H. Franke and T. Nelms and H. Yu and H. D. Achilles
                 and R. Salz",
  title =        "Exploiting heterogeneous multicore-processor systems
                 for high-performance network processing",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/franke02.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Franke:2010:IWS,
  author =       "H. Franke and J. Xenidis and C. Basso and B. M. Bass
                 and S. S. Woodward and J. D. Brown and C. L. Johnson",
  title =        "Introduction to the wire-speed processor and
                 architecture",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/franke03.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Iorio:2010:AFC,
  author =       "F. Iorio and K. M{\"u}ller and A. Castelfranco and O.
                 Callanan and T. Sanuki",
  title =        "Asymmetric flow control for data transfer in hybrid
                 computing systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/iorio-callanan.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{LaPotin:2010:WNO,
  author =       "D. P. LaPotin and S. Daijavad and C. L. Johnson and S.
                 W. Hunter and K. Ishizaki and H. Franke and H. D.
                 Achilles and D. P. Dumarot and N. A. Greco and B.
                 Davari",
  title =        "Workload and network-optimized computing systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/lapotin.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lin:2010:WNC,
  author =       "Y. Lin and L. Shao and Z. Zhu and Q. Wang and R. K.
                 Sabhikhi",
  title =        "Wireless network cloud: Architecture and system
                 requirements",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/lin.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Neeser:2010:SII,
  author =       "F. D. Neeser and B. Metzler and P. W. Frey",
  title =        "{SoftRDMA}: Implementing {iWARP} over {TCP} kernel
                 sockets",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/neeser.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ohara:2010:ARR,
  author =       "M. Ohara",
  title =        "Aggregating {REST} requests to accelerate {Web 2.0}
                 applications",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/ohara.html",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pattnaik:2010:P,
  author =       "P. Pattnaik and S. Daijavads",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wright:2010:SSP,
  author =       "C. P. Wright and E. M. Nahum and D. Wood and J. M.
                 Tracey and E. C. Hu",
  title =        "{SIP} server performance on multicore systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/wright-tracey.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zhu:2010:VPM,
  author =       "Z. Zhu and L. Chen and Y. Lin and L. Shao",
  title =        "{VoIP} performance on multicore platforms",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/541/zhu.html",
  acknowledgement = ack-nhfb,
  articleno =    "10",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bardhan:2010:IPP,
  author =       "I. R. Bardhan and R. J. Kauffman and S. Naranpanawe",
  title =        "{IT} project portfolio optimization: a risk
                 management approach to software development
                 governance",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/bardhan.html",
  acknowledgement = ack-nhfb,
  articleno =    "2",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Carney:2010:IME,
  author =       "J. G. Carney",
  title =        "Industry models for enterprise data management in
                 financial markets",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/carney.html",
  acknowledgement = ack-nhfb,
  articleno =    "6",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dubinsky:2010:EMR,
  author =       "Y. Dubinsky and A. Yaeli and A. Kofman",
  title =        "Effective management of roles and responsibilities:
                 Driving accountability in software development teams",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/dubinsky.html",
  acknowledgement = ack-nhfb,
  articleno =    "4",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eleftheriou:2010:ANP,
  author =       "E. Eleftheriou and S. {\"O}l{\c{c}}er and R. A.
                 Hutchins",
  title =        "Adaptive noise-predictive maximum-likelihood ({NPML})
                 data detection for magnetic tape storage systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/eleftheriou.html",
  acknowledgement = ack-nhfb,
  articleno =    "7",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ratakonda:2010:ITP,
  author =       "K. Ratakonda and R. Williams and J. Bisceglia and R.
                 W. Taylor and J. Graham",
  title =        "Identifying trouble patterns in complex {IT} services
                 engagements",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/ratakonda-williams.html",
  acknowledgement = ack-nhfb,
  articleno =    "5",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vahaniitty:2010:SSO,
  author =       "J. V{\"a}h{\"a}niitty and K. Rautiainen and C.
                 Lassenius",
  title =        "Small software organizations need explicit project
                 portfolio management",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/vahaniitty.html",
  acknowledgement = ack-nhfb,
  articleno =    "1",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wang:2010:SHD,
  author =       "L.-K. Wang and M. A. Erle and C. Tsen and E. M.
                 Schwarz and M. J. Schulte",
  title =        "A survey of hardware designs for decimal arithmetic",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "8:1--8:15",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2040930",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/wang-schwarz.html",
  abstract =     "Decimal data and decimal arithmetic operations are
                 ubiquitous in daily life. Although microprocessors
                 normally use binary arithmetic for computations,
                 decimal arithmetic is often required in financial and
                 commercial applications. Due to the increasing
                 importance of and demand for decimal arithmetic,
                 decimal floating-point (DFP) formats and operations are
                 specified in the revised IEEE Standard for
                 Floating-Point Arithmetic (IEEE 754-2008). This paper
                 provides a survey of hardware designs for decimal
                 arithmetic. It gives an overview of DFP arithmetic in
                 IEEE 754-2008, describes processors that provide
                 hardware and instruction set support for decimal
                 arithmetic, and provides a survey of hardware designs
                 for decimal addition, subtraction, multiplication, and
                 division. Finally, it describes potential areas for
                 future research.",
  acknowledgement = ack-nhfb,
  articleno =    "8",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "decimal floating-point arithmetic",
}

@Article{Williams:2010:P,
  author =       "Clay Williams and Murray Cantors and John J. Ritsko
                 and Editor-in-Chief",
  title =        "Preface",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/preface.html",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Woodward:2010:AMS,
  author =       "E. V. Woodward and R. Bowers and V. S. Thio and K.
                 Johnson and M. Srihari and C. J. Bracht",
  title =        "Agile methods for software practice transformation",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "2",
  pages =        "??--??",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat May 1 17:44:14 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  URL =          "http://www.research.ibm.com/journal/abstracts/rd/542/woodward.html",
  acknowledgement = ack-nhfb,
  articleno =    "3",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ray:2010:PBI,
  author =       "B. Ray and K. McAuliffe",
  title =        "Preface: Business Integrity and Risk Management",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "1--2",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2044842",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{vonKanel:2010:TKE,
  author =       "J. von Kanel and E. W. Cope and L. A. Deleris and N.
                 Nayak and R. G. Torok",
  title =        "Three key enablers to successful enterprise risk
                 management",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "1:1--1:15",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2043973",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hubbard:2010:PSM,
  author =       "D. Hubbard and D. Evans",
  title =        "Problems with scoring methods and ordinal scales in
                 risk assessment",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "2:1--2:10",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2042914",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Foley:2010:RMF,
  author =       "S. N. Foley and H. Moss",
  title =        "A risk-metric framework for enterprise risk
                 management",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "3:1--3:10",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2043403",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cope:2010:IRB,
  author =       "E. W. Cope and J. M. Kuster and D. Etzweiler and L. A.
                 Deleris and B. Ray",
  title =        "Incorporating risk into business process models",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "4:1--4:13",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2045777",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anderson:2010:FOI,
  author =       "E. E. Anderson",
  title =        "Firm objectives, {IT} alignment, and information
                 security",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "5:1--5:7",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2044256",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Elisseeff:2010:CNR,
  author =       "A. Elisseeff and J.-P. Pellet and E. Pratsini",
  title =        "Causal networks for risk and compliance: {Methodology}
                 and application",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "6:1--6:12",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2045251",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shafti:2010:SOC,
  author =       "F. Shafti and T. Bedford and L. A. Deleris and J. R.
                 M. Hosking and N. Serban and H. Shen and L. Walls",
  title =        "Service operation classification for risk management",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "3",
  pages =        "7:1--7:17",
  month =        may # "\slash " # jun,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2046465",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Martin:2010:PTS,
  author =       "J. L. Martin and H. Varilly and J. Cohn and G. R.
                 Wightwick",
  title =        "Preface: {Technologies} for a {Smarter Planet}",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--2",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2051498",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Harrison:2010:FSC,
  author =       "C. Harrison and B. Eckman and R. Hamilton and P.
                 Hartswick and J. Kalagnanam and J. Paraszczak and P.
                 Williams",
  title =        "Foundations for {Smarter Cities}",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--16",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2048257",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jennings:2010:MRS,
  author =       "P. Jennings",
  title =        "Managing the risks of {Smarter Planet} solutions",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--9",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2050540",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Spangler:2010:SPS,
  author =       "W. S. Spangler and J. T. Kreulen and Y. Chen and L.
                 Proctor and A. Alba and A. Lelescu and A. Behal",
  title =        "A smarter process for sensing the information space",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--13",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2050541",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Molloy:2010:IDC,
  author =       "C. Molloy and M. Iqbal",
  title =        "Improving data-center efficiency for a {Smarter
                 Planet}",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--8",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2050539",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stanford-Clark:2010:APS,
  author =       "A. J. Stanford-Clark and G. R. Wightwick",
  title =        "The application of publish\slash subscribe messaging
                 to environmental, monitoring, and control systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--7",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2050982",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Isom:2010:IEA,
  author =       "P. K. Isom and S. L. Miller-Sylvia and S. Vaidya",
  title =        "{Intelligent Enterprise Architecture}",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--2",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2051750",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ganis:2010:BRW,
  author =       "M. Ganis and E. M. Maximilien and T. Rivera",
  title =        "A brief report on working smarter with {Agile}
                 software development",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "4",
  pages =        "1--10",
  month =        jul # "\slash " # aug,
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2051279",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Sep 13 11:01:30 MDT 2010",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Blainey:2010:PCS,
  author =       "B. Blainey and H. Franke and M. Hind",
  title =        "Preface: Commercial software for multicore systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "0:1--0:3",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2064830",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sciampacone:2010:EMS,
  author =       "R. A. Sciampacone and V. Sundaresan and D. Maier and
                 T. Gray-Donald",
  title =        "Exploitation of multicore systems in a {Java} virtual
                 machine",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "1:1--1:11",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2057911",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Altman:2010:OTJ,
  author =       "E. Altman and M. Arnold and R. Bordawekar and R. M.
                 Delmonico and N. Mitchell and P. F. Sweeney",
  title =        "Observations on tuning a {Java} enterprise application
                 for performance and scalability",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "2:1--2:12",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2057090",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Agarwal:2010:DDP,
  author =       "R. Agarwal and S. Bensalem and E. Farchi and K.
                 Havelund and Y. Nir-Buchbinder and S. Stoller and S. Ur
                 and L. Wang",
  title =        "Detection of deadlock potentials in multithreaded
                 programs",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "3:1--3:15",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2060276",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Teng:2010:TPA,
  author =       "Q. M. Teng and H. C. Wang and Z. Xiao and P. F.
                 Sweeney and E. Duesterwald",
  title =        "{THOR}: a performance analysis tool for {Java}
                 applications running on multicore systems",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "4:1--4:17",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2058481",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cascaval:2010:TAA,
  author =       "C. Cascaval and S. Chatterjee and H. Franke and K. J.
                 Gildea and P. Pattnaik",
  title =        "A taxonomy of accelerator architectures and their
                 programming models",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "5:1--5:10",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2059721",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jann:2010:ASE,
  author =       "J. Jann and N. Dubey and R. S. Burugula and P.
                 Pattnaik",
  title =        "{AHAFS} subsystem for enhancing operating system
                 health in the cloud computing era",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "6:1--6:11",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2057091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cho:2010:OPP,
  author =       "S. M. Cho and D. W. Im and O. Y. Jang and H. J. Song
                 and B. D. Paulovicks and V. Sheinin and H. Yeo",
  title =        "{OpenCL} and parallel primitives for digital {TV}
                 applications",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "5",
  pages =        "7:1--7:14",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2062050",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:19 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shen:2010:PTE,
  author =       "X. Shen and M. Gupta and H. El-Shishiny and J. J.
                 Ritsko",
  title =        "Preface: Technology from emerging-market countries",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "0:1--0:2",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2080070",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zhang:2010:EEC,
  author =       "L. Zhang and S. Bao and H. Guo and H. Zhu and X. Zhang
                 and K. Cai and B. Fei and X. Wu and Z. Guo and Z. Su",
  title =        "{EagleEye}: Entity-centric business intelligence for
                 smarter decisions",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "1:1--1:11",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2069710",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{He:2010:MIS,
  author =       "G. He and Y. Sun and Q. Lu and T. Li and H. Lv and W.
                 Yin and J. Dong",
  title =        "Multi-index and self-approximate-optimal operation for
                 a smart electrical power grid",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "2:1--2:14",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2085461",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wang:2010:BBS,
  author =       "C. Wang and Y. Zhang and X. Chen and Z. Liu and L. Shi
                 and G. Chen and F. Qiu and C. Ying and W. Lu",
  title =        "A behavior-based {SMS} antispam system",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "3:1--3:16",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2066050",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Huang:2010:FBL,
  author =       "Y. Huang and H. Su and W. Sun and J. M. Zhang and C.
                 J. Guo and J. M. Xu and Z. B. Jiang and S. X. Yang and
                 J. Zhu",
  title =        "Framework for building a low-cost, scalable, and
                 secured platform for {Web}-delivered business
                 services",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "4:1--4:14",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2065891",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chenthamarakshan:2010:EDS,
  author =       "V. Chenthamarakshan and K. Dixit and M. Gattani and M.
                 Goyal and P. Gupta and N. Kambhatla and R. M. Lotlikar
                 and D. Majumdar and G. R. Parija and S. Roy and S. Soni
                 and K. Visweswariah",
  title =        "Effective decision support systems for workforce
                 deployment",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "5:1--5:15",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2074310",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Agarwal:2010:AIW,
  author =       "S. K. Agarwal and A. Kumar and A. A. Nanavati and N.
                 Rajput",
  title =        "Alternative information {Web} for visually impaired
                 users in developing countries",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "6:1--6:15",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2066350",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Modani:2010:DAT,
  author =       "N. Modani and K. Dey and S. Mukherjea and A. A.
                 Nanavati",
  title =        "Discovery and analysis of tightly knit communities in
                 telecom social networks",
  journal =      j-IBM-JRD,
  volume =       "54",
  number =       "6",
  pages =        "7:1--7:13",
  month =        "????",
  year =         "2010",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2081230",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Harrison:2011:PSC,
  author =       "C. Harrison and J. Paraszczak and R. P. Williams",
  title =        "Preface: Smarter Cities",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "0:1--0:5",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2093730",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Huestis:2011:CLC,
  author =       "E. M. Huestis and J. L. Snowdon",
  title =        "Complexity of legacy city resource management and
                 value modeling of interagency response",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "1:1--1:12",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2097510",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Besserud:2011:UDU,
  author =       "K. Besserud and T. Hussey",
  title =        "Urban design, urban simulation, and the need for
                 computational tools",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "2:1--2:17",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2097091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Juan:2011:DSS,
  author =       "Y.-K. Juan and L. Wang and J. Wang and J. O. Leckie
                 and K.-M. Li",
  title =        "A decision-support system for smarter city planning
                 and management",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "3:1--3:12",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2096572",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hogan:2011:USE,
  author =       "J. Hogan and J. Meegan and R. Parmar and V. Narayan
                 and R. J. Schloss",
  title =        "Using standards to enable the transformation to
                 smarter cities",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "4:1--4:10",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2091051",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Elgedawy:2011:DCC,
  author =       "I. Elgedawy",
  title =        "On-demand conversation customization for services in
                 large smart environments",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "5:1--5:14",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2087170",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rowe:2011:SAL,
  author =       "A. Rowe and M. E. Berges and G. Bhatia and E. Goldman
                 and R. Rajkumar and J. H. Garrett and J. M. F. Moura
                 and L. Soibelman",
  title =        "{Sensor Andrew}: Large-scale campus-wide sensing and
                 actuation",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "6:1--6:14",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2089662",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Watteyne:2011:SCT,
  author =       "T. Watteyne and K. S. J. Pister",
  title =        "Smarter cities through standards-based wireless sensor
                 networks",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "1--2",
  pages =        "7:1--7:10",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2010.2092257",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Feb 20 14:29:20 MST 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2011:FC,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "c1--c1",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2121870",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arroyo:2011:IPS,
  author =       "R. X. Arroyo and R. J. Harrington and S. P. Hartman
                 and T. Nguyen",
  title =        "{IBM POWER7} systems",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "1:1--1:13",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2131610",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sinharoy:2011:IPM,
  author =       "B. Sinharoy and R. Kalla and W. J. Starke and H. Q. Le
                 and R. Cargnoni and J. A. {Van Norstrand} and
                 B. J. Ronchetti and J. Stuecheli and J. Leenstra and
                 G. L. Guthrie and D. Q. Nguyen and B. Blaner and
                 C. F. Marino and E. Retter and P. Williams",
  title =        "{IBM POWER7} multicore server processor",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "1:1--1:29",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2127330",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wendel:2011:IPP,
  author =       "D. F. Wendel and J. Barth and D. M. Dreps and S. Islam
                 and J. Pille and J. A. Tierno",
  title =        "{IBM POWER7} processor circuit design",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "1:1--1:8",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2143150",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zyuban:2011:POM,
  author =       "V. Zyuban and J. Friedrich and C. J. Gonzalez and R.
                 Rao and M. D. Brown and M. M. Ziegler and H. Jacobson
                 and S. Islam and S. Chu and P. Kartschoke and G.
                 Fiorenza and M. Boersma and J. A. Culp",
  title =        "Power optimization methodology for the {IBM POWER7}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "1:1--1:9",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2110410",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rajamony:2011:PIP,
  author =       "R. Rajamony and L. B. Arimilli and K. Gildea",
  title =        "{PERCS}: The {IBM POWER7-IH} high-performance
                 computing system",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "3:1--3:12",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2109230",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  abstract =     "In 2001, the Defense Advanced Research Projects Agency
                 called for the creation of commercially viable
                 computing systems that would not only perform at very
                 high levels but also be highly productive. The
                 forthcoming POWER7-IH system known as Productive,
                 Easy-to-use, Reliable Computing System (PERCS) was
                 IBM's response to this challenge. Compared with
                 state-of-the-art high-performance computing systems in
                 existence today, PERCS has very high performance and
                 productivity goals and achieves them through tight
                 integration of computing, networking, storage, and
                 software. This paper describes the PERCS hardware and
                 software, along with many of the design decisions that
                 went into its creation.",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Iyer:2011:NSI,
  author =       "S. S. Iyer and G. Freeman and C. Brodsky and A. I.
                 Chou and D. Corliss and S. H. Jain and N. Lustig and V.
                 McGahay and S. Narasimha and J. Norum and K. A. Nummy
                 and P. Parries and S. Sankaran and C. D. Sheraw and P.
                 R. Varanasi and G. Wang and M. E. Weybright and X. Yu
                 and E. Crabbe and P. Agnello",
  title =        "45-nm silicon-on-insulator {CMOS} technology
                 integrating embedded {DRAM} for high-performance server
                 and {ASIC} applications",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "5:1--5:14",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2108112",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Floyd:2011:AEM,
  author =       "M. Floyd and M. Ware and K. Rajamani and T. Gloekler
                 and B. Brock and P. Bose and A. Buyuktosuno{\u{g}}lu
                 and J. C. Rubio and B. Schubert and B. Spruth and J. A.
                 Tierno and L. Pesantez",
  title =        "Adaptive energy-management features of the {IBM
                 POWER7} chip",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "8:1--8:18",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2114250",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Friedrich:2011:DMI,
  author =       "J. Friedrich and R. Puri and U. Brandt and M. Buehler
                 and J. DiLullo and J. Hopkins and M. Hossain and M.
                 Kazda and J. Keinert and Z. M. Kurzum and D. Lamb and
                 A. Lee and F. Musante and J. Noack and P. J. Osler and
                 S. Posluszny and H. Qian and S. Ramji and V. Rao and L.
                 N. Reddy and H. Ren and T. Rosser and B. R. Russell and
                 C. Sze and G. Tellez",
  title =        "Design methodology for the {IBM POWER7}
                 microprocessor",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "9:1--9:14",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2105692",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schubert:2011:FVI,
  author =       "K.-D. Schubert and W. Roesner and J. M. Ludden and J.
                 Jackson and J. Buchert and V. Paruthi and M. Behm and
                 A. Ziv and J. Schumann and C. Meissner and J. Koesters
                 and J. Hsu and B. Brock",
  title =        "Functional verification of the {IBM POWER7}
                 microprocessor and {POWER7} multiprocessor systems",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "10:1--10:17",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2117370",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:48 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kano:2011:UCM,
  author =       "Y. Kano and M. Miwa and K. B. Cohen and L. E. Hunter
                 and S. Ananiadou and J. Tsujii",
  title =        "{U}-Compare: a modular {NLP} workflow construction
                 and evaluation system",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "3",
  pages =        "11:1--11:10",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2105691",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri May 13 18:44:50 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tromp:2011:PCL,
  author =       "R. M. Tromp and J. B. Hannon",
  title =        "Preface: Cathode Lens Microscopy for Nanoscience",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "0:1--0:3",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2159450",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schramm:2011:LEE,
  author =       "S. M. Schramm and J. Kautz and A. Berghaus and O.
                 Schaff and R. M. Tromp and S. J. van der Molen",
  title =        "Low-energy electron microscopy and spectroscopy with
                 {ESCHER}: {Status} and prospects",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "1:1--1:7",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2150691",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mullerova:2011:STL,
  author =       "I. Mullerova and M. Hovorka and I. Konvalina and M.
                 Uncovsky and L. Frank",
  title =        "Scanning transmission low-energy electron microscopy",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "2:1--2:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2156190",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kennedy:2011:LCI,
  author =       "S. M. Kennedy and D. E. Jesson and D. M. Paganin",
  title =        "{Laplacian} and caustic imaging theories of {MEM}
                 work-function contrast",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "3:1--3:8",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2143310",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hofer:2011:LEP,
  author =       "A. Hofer and K. Duncker and M. Kiel and S. Forster and
                 W. Widdra",
  title =        "Laser-excited {PEEM} using a fully tunable fs-laser
                 system",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "4:1--4:8",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2156210",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Christensen:2011:PSE,
  author =       "S. L. Christensen and B. M. Haines and U. D. Lanke and
                 M. F. Paige and S. G. Urquhart",
  title =        "Partial secondary electron-yield {NEXAFS}
                 spectromicroscopy with an energy-filtered {X-PEEM}",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "5:1--5:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2143550",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zakharov:2011:NDB,
  author =       "A. A. Zakharov and C. Virojanadara and S.
                 Watcharinyanon and R. Yakimova and L. I. Johansson",
  title =        "Nanoscale {$3$-D} {$(E, k_x, k_y)$} band structure
                 imaging on graphene and intercalated graphene",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "6:1--6:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2143570",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sun:2011:HUS,
  author =       "J. Sun and J. B. Hannon and R. M. Tromp and K. Pohl",
  title =        "Highly uniform step and terrace structures on
                 {SiC(0001)} surfaces",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "7:1--7:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2156230",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:24 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meyer:2011:SOU,
  author =       "A. Meyer and J. I. Flege and S. D. Senanayake and B.
                 Kaemena and R. E. Rettew and F. M. Alamgir and J.
                 Falta",
  title =        "In situ oxidation of ultrathin silver films on
                 {Ni(111)}",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "8:1--8:7",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2157262",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wall:2011:SOC,
  author =       "D. Wall and S. Tikhonov and S. Sindermann and D.
                 Spoddig and C. Hassel and M. Horn-von Hoegen and F.-J.
                 Meyer zu Heringdorf",
  title =        "Shape, orientation, and crystalline composition of
                 silver islands on {Si(111)}",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "9:1--9:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2158761",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tang:2011:GDS,
  author =       "W.-X. Tang and C.-X. Zheng and Z.-Y. Zhou and D. E.
                 Jesson and J. Tersoff",
  title =        "{Ga} droplet surface dynamics during {Langmuir}
                 evaporation of {GaAs}",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "10:1--10:7",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2158762",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Speckmann:2011:ASI,
  author =       "M. Speckmann and T. Schmidt and J. I. Flege and J.
                 Falta",
  title =        "In adsorption on {Si(112)} and its impact on {Ge}
                 growth",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "11:1--11:8",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2158763",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yamaguchi:2011:XPS,
  author =       "R. Yamaguchi and K. Terashima and K. Fukumoto and Y.
                 Takada and M. Kotsugi and Y. Miyata and K. Mima and S.
                 Komori and S. Itoda and Y. Nakatsu and M. Yano and N.
                 Miyamoto and T. Nakamura and T. Kinoshita and Y.
                 Watanabe and A. Manabe and S. Suga and S. Imada",
  title =        "An {XMCD--PEEM} study on magnetized {Dy-doped
                 Nd--Fe-B} permanent magnets",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "12:1--12:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2159148",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kotsugi:2011:DMA,
  author =       "M. Kotsugi and T. Wakita and T. Taniuchi and H.
                 Maruyama and C. Mitsumata and K. Ono and M. Suzuki and
                 N. Kawamura and N. Ishimatsu and M. Oshima and Y.
                 Watanabe and M. Taniguchi",
  title =        "Direct metallographic analysis of an iron meteorite
                 using hard {X}-ray photoelectron emission microscopy",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "13:1--13:5",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2159159",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vaughn:2011:TEE,
  author =       "J. M. Vaughn and C. Wan and K. D. Jamison and M. E.
                 Kordesch",
  title =        "Thermionic electron emission microscopy of metal-oxide
                 multilayers on tungsten",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "14:1--14:6",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2159423",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hlawacek:2011:DSG,
  author =       "G. Hlawacek and F. S. Khokar and R. van Gastel and C.
                 Teichert and B. Poelsema",
  title =        "Diffusion and submonolayer growth of para-sexiphenyl
                 on {Ir(111)} and {Ir(111)}-supported graphene",
  journal =      j-IBM-JRD,
  volume =       "55",
  number =       "4",
  pages =        "15:1--15:7",
  month =        "????",
  year =         "2011",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2160303",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Sep 16 12:27:25 MDT 2011",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 http://www.research.ibm.com/journal/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:FCa,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "C1--C1",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2181688",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "1--2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2184492",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Haas:2012:IIZ,
  author =       "J. Haas and R. Wallner",
  title =        "Introduction: {IBM zEnterprise} Systems and
                 Technology",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "0:1--0:6",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2173854",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Busaba:2012:IZM,
  author =       "F. Busaba and M. A. Blake and B. Curran and M. Fee and
                 C. Jacobi and P.-K. Mak and B. R. Prasky and C. R.
                 Walters",
  title =        "{IBM zEnterprise 196} microprocessor and cache
                 subsystem",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "1:1--1:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2173962",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Strach:2012:EPI,
  author =       "T. Strach and F. Bosco and K. L. Christian and K. R.
                 Covi and M. Eckert and G. R. Edlund and R. Frech and H.
                 Harrer and A. Huber and D. Kaller and M. Kindscher and
                 A. Z. Muszynski and G. A. Peterson and C. Siviero and
                 J. Supper and O. A. Torreiter and T.-M. Winkel",
  title =        "Electronic packaging of the {IBM System z196}
                 enterprise-class server processor cage",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "2:1--2:19",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177107",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{VanHuben:2012:SCD,
  author =       "G. A. {Van Huben} and K. D. Lamb and R. B. Tremaine
                 and B. E. Aleman and S. M. Rubow and S. H. Rider and
                  W. E. Maule and M. E. Wazlowski",
  title =        "Server-class {DDR3 SDRAM} memory buffer chip",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "3:1--3:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177897",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meaney:2012:IZR,
  author =       "P. J. Meaney and L. A. Lastras-Montano and V. K.
                 Papazova and E. Stephens and J. S. Johnson and L. C.
                 Alves and J. A. O'Connor and W. J. Clarke",
  title =        "{IBM zEnterprise} redundant array of independent
                 memory subsystem",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "4:1--4:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177106",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webel:2012:SMP,
  author =       "T. Webel and T. Pflueger and R. Ludewig and C.
                 Lichtenau and W. Niklaus and R. Schaufler",
  title =        "Scalable and modular pervasive logic\slash firmware
                 design",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "5:1--5:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177571",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Greiner:2012:PII,
  author =       "D. F. Greiner and M. M. Mitran and T. J. Slegel and C.
                 R. Walters and C. F. Webb",
  title =        "Performance innovation in the {IBM zEnterprise 196}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "6:1--6:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177906",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Conklin:2012:CUS,
  author =       "C. R. Conklin and W. Niklaus and R. Schaufler and S.
                 Swaney",
  title =        "Concurrently update the scan-initialization data of a
                 processor core",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "7:1--7:6",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177908",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gregg:2012:OIZ,
  author =       "T. A. Gregg and D. Craddock and D. J. Stigliani and F.
                 E. Bosco and E. E. Cruz and M. F. Scanlon and P. Sciuto
                 and G. Bayer and M. Jung and C. Raisch",
  title =        "Overview of {IBM zEnterprise 196 I/O} subsystem with
                 focus on new {PCI Express} infrastructure",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "8:1--8:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2178278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dorsch:2012:IPS,
  author =       "R. Dorsch and R. K. Errickson and M. M. Helms and G.
                 Crew and T. A. Gregg and W. Haileselassie and L. W.
                 Helmer and A. Kohler and K. Pandey and S. Roscher and
                 E. S. Rotter and C. Haubelt",
  title =        "{IBM Parallel Sysplex} design for the {IBM z196}
                 system",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "9:1--9:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177910",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arnold:2012:ICC,
  author =       "T. W. Arnold and C. Buscaglia and F. Chan and V.
                 Condorelli and J. Dayka and W. Santiago-Fernandez and
                 N. Hadzic and M. D. Hocker and M. Jordan and T. E.
                 Morris and K. Werner",
  title =        "{IBM 4765} cryptographic coprocessor",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "10:1--10:13",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2178736",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Amann:2012:IZS,
  author =       "S. Amann and G. Banzhaf and C. A. Bender and T. Bubb
                 and D. F. Casper and J. R. Flanagan and R. Friedrich
                 and R. Higgs and G. Kuch and C. Schmitt and M. Zee",
  title =        "{IBM zEnterprise} storage {I/O} advancements",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "11:1--11:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2177919",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andres:2012:IZE,
  author =       "M. Andres and A. Bieswanger and F. Bosco and G. F.
                 Goth and H. Hering and W. Kostenko and T. B. Mathias
                 and T. Pohl and H. Wen",
  title =        "{IBM zEnterprise} energy management",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "12:1--12:13",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2178565",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Krygowski:2012:KAP,
  author =       "C. A. Krygowski and E. Almog and D. G. Bair and R.
                 Breil and G. Dittmann and R. M. Gott and W. J. Lewis
                 and A. D. Shah and B. W. Thompto",
  title =        "Key advances in the presilicon functional verification
                 of the {IBM zEnterprise} microprocessor and storage
                 hierarchy",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "13:1--13:16",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2178737",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koerner:2012:FVS,
  author =       "S. Koerner and C. Werner and T. Hess and P. Schulz and
                 M. Strasser and S. Wagner and H. B{\"o}hm and
                 M. Troester and D. Bolte and H. Elfering and T. Pohl
                 and K. Theurich and W. H. Miller and P. Szwed",
  title =        "Firmware verification and simulation in {IBM
                 zEnterprise 196}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "14:1--14:17",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2178566",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Beichter:2012:ISZ,
  author =       "F. Beichter and T. D. Butler and S. B. Compton and D.
                 F. Riedy and M. H. Sabins and H. M. Yudenfriend",
  title =        "{IBM System z I/O} discovery and autoconfiguration",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "15:1--15:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2179230",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Frey:2012:IUR,
  author =       "J. A. Frey and F. Baitinger and J. M. Gdaniec",
  title =        "{IBM Unified Resource Manager} introduction and
                 overview",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "16:1--16:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2179133",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Valentine:2012:IZH,
  author =       "B. D. Valentine and H. Osterndorf and F. M. Welter and
                 D. Appich and J. A. Wierbowski and D. T. Simpson",
  title =        "{IBM zBX} hardware management and operational
                 controls",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "17:1--17:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2179229",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mayer:2012:URM,
  author =       "C. Mayer and F. Baitinger and S. Amann and G. McAfee
                 and A. Nunez Mencias",
  title =        "{Unified Resource Manager} virtualization management",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "18:1--18:9",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2011.2180750",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yocom:2012:IZU,
  author =       "P. Yocom and H. Shah and M. F. Hulber",
  title =        "{IBM zEnterprise Unified Resource Manager} platform
                 performance management",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "1--2",
  pages =        "19:1--19:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2182856",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:FCb,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3",
  pages =        "C1--C1",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2190556",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "1--2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2190560",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ferrucci:2012:IW,
  author =       "D. A. Ferrucci",
  title =        "Introduction to {This is Watson}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "1:1--1:15",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2184356",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lally:2012:QAH,
  author =       "A. Lally and J. M. Prager and M. C. McCord and B. K.
                 Boguraev and S. Patwardhan and J. Fan and P. Fodor and
                 J. Chu-Carroll",
  title =        "Question analysis: How {Watson} reads a clue",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "2:1--2:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2184637",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McCord:2012:DPW,
  author =       "M. C. McCord and J. W. Murdock and B. K. Boguraev",
  title =        "Deep parsing in {Watson}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "3:1--3:15",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2185409",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chu-Carroll:2012:TRA,
  author =       "J. Chu-Carroll and J. Fan and N. Schlaefer and W.
                 Zadrozny",
  title =        "Textual resource acquisition and engineering",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "4:1--4:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2185901",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fan:2012:AKE,
  author =       "J. Fan and A. Kalyanpur and D. C. Gondek and D. A.
                 Ferrucci",
  title =        "Automatic knowledge extraction from documents",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "5:1--5:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2186519",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chu-Carroll:2012:FNH,
  author =       "J. Chu-Carroll and J. Fan and B. K. Boguraev and D.
                 Carmel and D. Sheinwald and C. Welty",
  title =        "Finding needles in the haystack: Search and candidate
                 generation",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "6:1--6:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2186682",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Murdock:2012:TCA,
  author =       "J. W. Murdock and A. Kalyanpur and C. Welty and J. Fan
                 and D. A. Ferrucci and D. C. Gondek and L. Zhang and H.
                 Kanayama",
  title =        "Typing candidate answers using type coercion",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "7:1--7:13",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2187036",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Murdock:2012:TEG,
  author =       "J. W. Murdock and J. Fan and A. Lally and H. Shima and
                 B. K. Boguraev",
  title =        "Textual evidence gathering and analysis",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "8:1--8:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2187249",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wang:2012:RES,
  author =       "C. Wang and A. Kalyanpur and J. Fan and B. K. Boguraev
                 and D. C. Gondek",
  title =        "Relation extraction and scoring in {DeepQA}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "9:1--9:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2187239",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kalyanpur:2012:SDI,
  author =       "A. Kalyanpur and B. K. Boguraev and S. Patwardhan and
                 J. W. Murdock and A. Lally and C. Welty and J. M.
                 Prager and B. Coppola and A. Fokoue-Nkoutche and L.
                 Zhang and Y. Pan and Z. M. Qiu",
  title =        "Structured data and inference in {DeepQA}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "10:1--10:14",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188737",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Prager:2012:SQT,
  author =       "J. M. Prager and E. W. Brown and J. Chu-Carroll",
  title =        "Special questions and techniques",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "11:1--11:13",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2187392",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chu-Carroll:2012:IIR,
  author =       "J. Chu-Carroll and E. W. Brown and A. Lally and J. W.
                 Murdock",
  title =        "Identifying implicit relationships",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "12:1--12:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188154",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kalyanpur:2012:FBQ,
  author =       "A. Kalyanpur and S. Patwardhan and B. K. Boguraev and
                 A. Lally and J. Chu-Carroll",
  title =        "Fact-based question decomposition in {DeepQA}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "13:1--13:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188934",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gondek:2012:FMR,
  author =       "D. C. Gondek and A. Lally and A. Kalyanpur and J. W.
                 Murdock and P. A. Duboue and L. Zhang and Y. Pan and Z.
                 M. Qiu and C. Welty",
  title =        "A framework for merging and ranking of answers in
                 {DeepQA}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "14:1--14:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188760",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Epstein:2012:MWF,
  author =       "E. A. Epstein and M. I. Schor and B. S. Iyer and A.
                 Lally and E. W. Brown and J. Cwiklik",
  title =        "Making {Watson} fast",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "15:1--15:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188761",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tesauro:2012:SLO,
  author =       "G. Tesauro and D. C. Gondek and J. Lenchner and J. Fan
                 and J. M. Prager",
  title =        "Simulation, learning, and optimization techniques in
                 {Watson}'s game strategies",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "16:1--16:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188931",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lewis:2012:GIB,
  author =       "B. L. Lewis",
  title =        "In the game: The interface between {Watson} and
                 {Jeopardy}!",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "3--4",
  pages =        "17:1--17:6",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2188932",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Apr 13 09:44:32 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen-Ritzo:2012:PTH,
  author =       "C.-H. Chen-Ritzo and J. Hu",
  title =        "Preface: Technologies for healthcare transformation",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "0:1--0:2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2191182",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261576",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shabo:2012:MUP,
  author =       "A. Shabo",
  title =        "Meaningful use of patient-centric health records for
                 healthcare transformation",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "1:1--1:7",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2194011",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261583",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "1--2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2205304",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261572",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Buckeridge:2012:IRT,
  author =       "D. L. Buckeridge and M. Izadi and A. Shaban-Nejad and
                 L. Mondor and C. Jauvin and L. Dube and Y. Jang and R.
                 Tamblyn",
  title =        "An infrastructure for real-time population health
                 assessment and monitoring",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "2:1--2:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2197132",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261575",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sow:2012:RTA,
  author =       "D. M. Sow and J. Sun and A. Biem and J. Hu and M. L.
                 Blount and S. Ebadollahi",
  title =        "Real-time analysis for short-term prognosis in
                 intensive care",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "3:1--3:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2197952",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261584",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Markatou:2012:CBR,
  author =       "M. Markatou and P. K. Don and J. Hu and F. Wang and J.
                 Sun and R. Sorrentino and S. Ebadollahi",
  title =        "Case-based reasoning in comparative effectiveness
                 research",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "4:1--4:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2198311",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261579",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sun:2012:FOS,
  author =       "X. Sun and L. Xu and Y. Yu and Y. Pan",
  title =        "Facilitating observational study for comparative
                 effectiveness research",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "5:1--5:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2198589",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261585",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gotz:2012:MVA,
  author =       "D. H. Gotz and J. Sun and N. Cao",
  title =        "Multifaceted visual analytics for healthcare
                 applications",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "6:1--6:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2199170",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261577",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ordonez:2012:VMT,
  author =       "P. Ordonez and T. Oates and M. E. Lombardi and G.
                 Hernandez and K. W. Holmes and J. Fackler and C. U.
                 Lehmann",
  title =        "Visualization of multivariate time-series data in a
                 neonatal {ICU}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "7:1--7:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2200431",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261581",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mason:2012:CDM,
  author =       "J. E. Mason and B. T. Denton",
  title =        "A comparison of decision-maker perspectives for
                 optimal cholesterol treatment",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "8:1--8:12",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2201849",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261580",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marinescu:2012:ATD,
  author =       "R. Marinescu",
  title =        "Assessing technical debt by identifying design flaws
                 in software systems",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "9:1--9:13",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2204512",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261578",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Robertson-Dunn:2012:BZF,
  author =       "B. Robertson-Dunn",
  title =        "Beyond the {Zachman} framework: Problem-oriented
                 system architecture",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "10:1--10:9",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2205633",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261582",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:Ca,
  author =       "Anonymous",
  title =        "Cover 2",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "C2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2205306",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261573",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:Cb,
  author =       "Anonymous",
  title =        "Cover 3",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "C3",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2205307",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6261574",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:FCc,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "5",
  pages =        "C1",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2205305",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 11 14:32:34 MDT 2012",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6257445",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sanford:2012:MSV,
  author =       "L. S. Sanford",
  title =        "Message from the {Senior Vice President, Enterprise
                 Transformation}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "0:1",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2217672",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353931",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vayghan:2012:PIE,
  author =       "J. Vayghan",
  title =        "Preface: {IT}-enabled business transformation at
                 {IBM}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "0:1--0:3",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2206849",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353962",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Urso:2012:ETI,
  author =       "D. L. Urso and M. T. Dunham and C. Passi and M.
                 Overstreet and J. Viezel and N. Harling",
  title =        "Enterprise transformation: The {IBM} journey to {Value
                 Services}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "1:1--1:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2207773",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353958",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:TC,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "1--2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2225975",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6356006",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{DeViney:2012:BGI,
  author =       "N. DeViney and K. Sturtevant and F. Zadeh and L.
                 Peluso and P. Tambor",
  title =        "Becoming a globally integrated enterprise: Lessons on
                 enabling organizational and cultural change",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "2:1--2:8",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2206149",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353944",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Massie:2012:ITR,
  author =       "J. G. Massie and W. J. Davis",
  title =        "{IBM} toolkit for radical simplification of business
                 processes",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "3:1--3:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2210337",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353952",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sylvia:2012:TIT,
  author =       "M. J. Sylvia and R. C. Hughes and J. E. Moore and J.
                 W. Murray and B. L. Peterson and S. R. Uniack",
  title =        "Transforming the information technology infrastructure
                 of {IBM}",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "4:1--4:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2211811",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353955",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Danko:2012:HPE,
  author =       "T. Danko and D. G. Downs and A. Dunlap-Kraft and J. R.
                 Walkup",
  title =        "Helping people embrace change in {IT}-enabled business
                 transformations",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "5:1--5:9",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2212634",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353943",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schaffer:2012:EII,
  author =       "J. S. Schaffer and M. L. Stokes and N. Yan",
  title =        "Enabling an integrated identity from disparate
                 sources",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "6:1--6:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2214091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6355654",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "digital identities for Web users; social computing;
                 user privacy",
}

@Article{Apte:2012:BLT,
  author =       "C. Apte and B. Dietrich and M. Fleming",
  title =        "Business leadership through analytics",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "7:1--7:5",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2214555",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353941",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baier:2012:SFP,
  author =       "M. Baier and J. E. Carballo and A. J. Chang and Y. Lu
                 and A. Mojsilovic and M. J. Richard and M. Singh and M.
                 S. Squillante and K. R. Varshney",
  title =        "Sales-force performance analytics and optimization",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "8:1--8:10",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2216314",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353942",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kapoor:2012:ETA,
  author =       "S. Kapoor and B. K. Ray and C. Toft-Nielsen and K.
                 Dobrindt and K. Anikeev and D. Subramanian and Y.
                 Drissi and C. Jiang and J. Fu",
  title =        "Enterprise transformation: An analytics-based approach
                 to strategic planning",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "9:1--9:11",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2217673",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353948",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yarter:2012:PCD,
  author =       "L. C. Yarter",
  title =        "Private cloud delivery model for supplying centralized
                 analytics services",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "10:1--10:6",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2216331",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353964",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dischinger:2012:SCS,
  author =       "J. S. Dischinger and C. D. Karwatowski and A. Raina",
  title =        "Supplier Connection: a supply-chain ecosystem for
                 small business job growth",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "11:1--11:9",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2218071",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353945",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:Cc,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "C1--C1",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2216212",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353937",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:Cd,
  author =       "Anonymous",
  title =        "Cover 2",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "C2--C2",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2216214",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353939",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2012:Ce,
  author =       "Anonymous",
  title =        "Cover 3",
  journal =      j-IBM-JRD,
  volume =       "56",
  number =       "6",
  pages =        "C3--C3",
  month =        "????",
  year =         "2012",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2216215",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Jan 25 11:44:56 MST 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6353940",
  acknowledgement = ack-nhfb,
  book-URL =     "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Team:2013:IBG,
  author =       "{IBM Blue Gene Team}",
  title =        "The {IBM Blue Gene} project",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "0:1--0:6",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2220487",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Team:2013:DIB,
  author =       "{IBM Blue Gene Team}",
  title =        "Design of the {IBM Blue Gene\slash Q} Compute chip",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "1:1--1:13",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2222991",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coteus:2013:PIB,
  author =       "P. W. Coteus and S. A. Hall and T. Takken and R. A.
                 Rand and S. Tian and G. V. Kopcsay and R. Bickford and
                 F. P. Giordano and C. M. Marroquin and M. J. Jeanson",
  title =        "Packaging the {IBM Blue Gene\slash Q} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "2:1--2:13",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2225922",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sugavanam:2013:DLP,
  author =       "K. Sugavanam and C.-Y. Cher and J. A. Gunnels and R.
                 A. Haring and P. Heidelberger and H. M. Jacobson and M.
                 K. McManus and D. P. Paulsen and D. L. Satterfield and
                 Y. Sugawara and R. Walkup",
  title =        "Design for low power and power management in {IBM Blue
                 Gene\slash Q}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "3:1--3:11",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2227034",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bertran:2013:ALP,
  author =       "R. Bertran and Y. Sugawara and H. M. Jacobson and A.
                 Buyuktosunoglu and P. Bose",
  title =        "Application-level power and performance
                 characterization and optimization on {IBM Blue
                 Gene\slash Q} systems",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "4:1--4:17",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2227580",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ryu:2013:IBG,
  author =       "K. D. Ryu and T. A. Inglett and R. Bellofatto and M.
                 A. Blocksome and T. Gooding and S. Kumar and A. R.
                 Mamidala and M. G. Megerian and S. Miller and M. T.
                 Nelson and B. Rosenburg and B. Smith and J. {Van
                 Oosten} and A. Wang and R. W. Wisniewski",
  title =        "{IBM Blue Gene\slash Q} system software stack",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "5:1--5:12",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2227557",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Team:2013:MVC,
  author =       "{IBM Blue Gene Team}",
  title =        "Modeling, validation, and co-design of {IBM Blue
                 Gene\slash Q}: Tools and examples",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "6:1--6:12",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2227577",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ohmacht:2013:IBG,
  author =       "M. Ohmacht and A. Wang and T. Gooding and B. Nathanson
                 and I. Nair and G. Janssen and M. Schaal and B.
                 Steinmacher-Burow",
  title =        "{IBM Blue Gene\slash Q} memory subsystem with
                 speculative execution and transactional memory",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "7:1--7:12",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2228092",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eichenberger:2013:ELO,
  author =       "A. E. Eichenberger and K. O'Brien",
  title =        "Experimenting with low-overhead {OpenMP} runtime on
                 {IBM Blue Gene\slash Q}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "8:1--8:8",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2228769",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Evangelinos:2013:DPC,
  author =       "C. Evangelinos and R. E. Walkup and V. Sachdeva and K.
                 E. Jordan and H. Gahvari and I.-H. Chung and M. P.
                 Perrone and L. Lu and L.-K. Liu and K. Magerlein",
  title =        "Determination of performance characteristics of
                 scientific applications on {IBM Blue Gene\slash Q}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "9:1--9:12",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2229901",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Checconi:2013:MDA,
  author =       "F. Checconi and F. Petrini",
  title =        "Massive data analytics: The {Graph 500} on {IBM Blue
                 Gene\slash Q}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "10:1--10:11",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2232414",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Carnes:2013:SLI,
  author =       "B. Carnes and B. Chan and E. W. Draeger and J.-L.
                 Fattebert and L. Fried and J. Glosli and W. D. Krauss
                 and S. H. Langer and R. McCallen and A. A. Mirin and F.
                 Najjar and A. L. Nichols and T. Oppelstrup and J. A.
                 Rathkopf and D. Richards and F. Streitz and P. M.
                 Vranas and J. J. Rice and J. A. Gunnels and V. Gurev
                 and C. Kim and J. Magerlein and M. Reumann and H.-F.
                 Wen",
  title =        "Science at {LLNL} with {IBM Blue Gene\slash Q}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "11:1--11:18",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2233371",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coghlan:2013:AAI,
  author =       "S. Coghlan and K. Kumaran and R. M. Loy and P. Messina
                 and V. Morozov and J. C. Osborn and S. Parker and K. M.
                 Riley and N. A. Romero and T. J. Williams",
  title =        "{Argonne} applications for the {IBM Blue Gene\slash
                 Q}, {Mira}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "12:1--12:11",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2238371",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Boyle:2013:CDI,
  author =       "P. A. Boyle and N. H. Christ and C. Kim",
  title =        "Co-design of the {IBM Blue Gene\slash Q Level 1}
                 prefetch engine with {QCD}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "13:1--13:10",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2237149",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Alam:2013:EES,
  author =       "S. Alam and C. Bekas and H. Boettiger and A. Curioni
                 and G. Fourestey and W. Homberg and M. Knobloch and T.
                 Laino and T. Maurer and B. Mohr and D. Pleiter and A.
                 Schiller and T. Schulthess and V. Weber",
  title =        "Early experiences with scientific applications on the
                 {IBM Blue Gene\slash Q} supercomputer",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "14:1--14:9",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2234331",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dong:2013:FEV,
  author =       "J. Dong and M. Xie and L. Zhao and D. Shang",
  title =        "A framework for electric vehicle charging-point
                 network optimization",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "1/2",
  pages =        "15:1--15:9",
  month =        jan # "--" # mar,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2012.2234325",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:15 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Malik:2013:GBD,
  author =       "P. Malik",
  title =        "Governing {Big Data}: Principles and practices",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "1:1--1:13",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2241359",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ghoting:2013:TOM,
  author =       "A. N. Ghoting and J. A. Gunnels and P. Kambadur and E.
                 P. Pednault and M. S. Squillante",
  title =        "Trends and outlook for the massive-scale analytics
                 stack",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "2:1--2:11",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2242673",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hofstee:2013:USD,
  author =       "H. P. Hofstee and G. C. Chen and F. H. Gebara and K.
                 Hall and J. Herring and D. Jamsek and J. Li and Y. Li
                 and J. W. Shi and P. W. Y. Wong",
  title =        "Understanding system design for {Big Data} workloads",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "3:1--3:10",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2242674",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Balmin:2013:PEA,
  author =       "A. Balmin and K. Beyer and V. Ercegovac and J.
                 McPherson and F. Ozcan and H. Pirahesh and E. Shekita
                 and Y. Sismanis and S. Tata and Y. Tian",
  title =        "A platform for {eXtreme Analytics}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "4:1--4:11",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2242693",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jain:2013:GSE,
  author =       "R. Jain and P. Sarkar and D. Subhraveti",
  title =        "{GPFS--SNC}: An enterprise cluster file system for
                 {Big Data}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "5:1--5:10",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2243531",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fong:2013:TSD,
  author =       "L. L. Fong and Y. Gao and X. R. Guerin and Y. G. Liu
                 and T. Salo and S. R. Seelam and W. Tan and S. Tata",
  title =        "Toward a scale-out data-management middleware for
                 low-latency enterprise computing",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "6:1--6:14",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2240171",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hirzel:2013:ISP,
  author =       "M. Hirzel and H. Andrade and B. Gedik and G.
                 Jacques-Silva and R. Khandekar and V. Kumar and M.
                 Mendell and H. Nasgaard and S. Schneider and R. Soule
                 and K.-L. Wu",
  title =        "{IBM Streams Processing Language}: Analyzing {Big
                 Data} in motion",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "7:1--7:11",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2243535",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Biem:2013:RTA,
  author =       "A. Biem and H. Feng and A. V. Riabov and D. S.
                 Turaga",
  title =        "Real-time analysis and management of big time-series
                 data",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "8:1--8:12",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2243551",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kasiviswanathan:2013:NDD,
  author =       "S. P. Kasiviswanathan and G. Cong and P. Melville and
                 R. D. Lawrence",
  title =        "Novel document detection for massive data streams
                 using distributed dictionary learning",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "9:1--9:15",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2247232",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gattiker:2013:BDT,
  author =       "A. Gattiker and F. H. Gebara and H. P. Hofstee and J.
                 D. Hayes and A. Hylick",
  title =        "{Big Data} text-oriented benchmark creation for
                 {Hadoop}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "10:1--10:6",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2240732",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zerfos:2013:PAM,
  author =       "P. Zerfos and M. Srivatsa and H. Yu and D. Dennerline
                 and H. Franke and D. Agrawal",
  title =        "Platform and applications for massive-scale streaming
                 network analytics",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "11:1--11:13",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2245991",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shi:2013:SCD,
  author =       "J. Shi and W. Xue and W. Wang and Y. Zhang and B. Yang
                 and J. Li",
  title =        "Scalable community detection in massive social
                 networks using {MapReduce}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "12:1--12:14",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2251982",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Liao:2013:VAL,
  author =       "Q. Liao and L. Shi and C. Wang",
  title =        "Visual analysis of large-scale network anomalies",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "13:1--13:12",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2249356",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Konopnicki:2013:SAM,
  author =       "D. Konopnicki and M. Shmueli-Scheuer and D. Cohen and
                 B. Sznajder and J. Herzig and A. Raviv and N. Zwerling
                 and H. Roitman and Y. Mass",
  title =        "A statistical approach to mining customers'
                 conversational data from social media",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "14:1--14:13",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2251833",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hayes:2013:RTS,
  author =       "J. P. Hayes and H. R. Kolar and A. Akhriev and M. G.
                 Barry and M. E. Purcell and E. P. McKeown",
  title =        "A real-time stream storage and analysis platform for
                 underwater acoustic monitoring",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "15:1--15:10",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2245973",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Soffer:2013:PMS,
  author =       "A. Soffer",
  title =        "Preface: Massive-scale analytics",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "3/4",
  pages =        "??--??",
  month =        may # "--" # jul,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jun 24 12:47:17 MDT 2013",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bartholomy:2013:NMT,
  author =       "E. Bartholomy and G. Greenlee and M. Sylvia",
  title =        "The need to move toward virtualized and more resilient
                 disaster-recovery architectures",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "1:1--1:10",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2258759",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vecchiola:2013:ERI,
  author =       "C. Vecchiola and H. Anjomshoa and Y. Bernstein and I.
                 Dumitrescu and R. Garnavi and J. von Kanel and G.
                 Wightwick",
  title =        "Engineering resilient information systems for
                 emergency management",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "2:1--2:12",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2259432",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Queiroz:2013:PMQ,
  author =       "C. Queiroz and S. K. Garg and Z. Tari",
  title =        "A probabilistic model for quantifying the resilience
                 of networked systems",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "3:1--3:9",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2259433",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rogstadius:2013:CCS,
  author =       "J. Rogstadius and M. Vukovic and C. A. Teixeira and V.
                 Kostakos and E. Karapanos and J. A. Laredo",
  title =        "{CrisisTracker}: Crowdsourced social media curation
                 for disaster awareness",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "4:1--4:13",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2260692",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sips:2013:CEB,
  author =       "R.-J. Sips and A. {van der Vlis} and R. Nagel and B.
                 Havers",
  title =        "A case for evidence-based levee management using
                 sensor technology",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "5:1--5:12",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2261213",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Osogami:2013:TSE,
  author =       "T. Osogami and T. Imamichi and H. Mizuta and T.
                 Suzumura and T. Ide",
  title =        "Toward simulating entire cities with behavioral models
                 of traffic",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "6:1--6:10",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2264906",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Treinish:2013:EHR,
  author =       "L. A. Treinish and A. P. Praino and J. P. Cipriani and
                 U. T. Mello and K. Mantripragada and L. C. Villa Real
                 and P. A. Sesini and V. Saxena and T. George and R.
                 Mittal",
  title =        "Enabling high-resolution forecasting of severe weather
                 and flooding events in {Rio de Janeiro}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "7:1--7:11",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2263414",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ein-Dor:2013:ARM,
  author =       "L. Ein-Dor and Y. Goldschmidt and O. Lavi and G. E.
                 Miller and M. Ninio and D. Dillenberger",
  title =        "Analytics for resiliency in the mainframe",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "8:1--8:5",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2263891",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dillenberger:2013:CBM,
  author =       "D. Dillenberger and D. Petersen",
  title =        "A contrast between mainframe {Parallel Sysplex}
                 availability and selected distributed computing
                 availability solutions",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "9:1--9:14",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2266752",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Salapura:2013:RCC,
  author =       "V. Salapura and R. Harper and M. Viswanathan",
  title =        "Resilient cloud computing",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "10:1--10:12",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2266972",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Guerard:2013:EGP,
  author =       "J. B. Guerard and S. T. Rachev and B. P. Shao",
  title =        "Efficient global portfolios: Big data and investment
                 universes",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "11:1--11:11",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2272483",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2013:FC,
  author =       "Anonymous",
  title =        "[Front-cover]",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "??--??",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2013:TCa,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "??--??",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Paraszczak:2013:PDR,
  author =       "J. Paraszczak and H. Watanabe and P. Williams",
  title =        "Preface: Disaster recovery and resilient computing",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "5",
  pages =        "??--??",
  month =        sep # "--" # oct,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:44 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zyuban:2013:IPD,
  author =       "V. Zyuban and S. A. Taylor and B. Christensen and A.
                 R. Hall and C. J. Gonzalez and J. Friedrich and F.
                 Clougherty and J. Tetzloff and R. Rao",
  title =        "{IBM POWER7+} design for higher frequency at fixed
                 power",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "1:1--1:18",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279597",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Floyd:2013:RPR,
  author =       "M. S. Floyd and A. Drake and N. S. Schwartz and R. W.
                 Berry and C. R. Lefurgy and M. Ware and K. Rajamani and
                 V. Zyuban and R. Willaman and R. M. Zgabay",
  title =        "Runtime power reduction capability of the {IBM
                 POWER7+} chip",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "2:1--2:17",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279598",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Blaner:2013:IPP,
  author =       "B. Blaner and B. Abali and B. M. Bass and S. Chari and
                 R. Kalla and S. Kunkel and K. Lauricella and R. Leavens
                 and J. J. Reilly and P. A. Sandon",
  title =        "{IBM POWER7+} processor on-chip accelerators for
                 cryptography and active memory expansion",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "3:1--3:16",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2280090",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Liberty:2013:THR,
  author =       "John S. Liberty and Adrian Barrera and David W.
                 Boerstler and Thomas B. Chadwick and Scott R. Cottier
                 and H. Peter Hofstee and Julie A. Rosser and Marty L.
                 Tsai",
  title =        "True hardware random number generation implemented in
                 the $ 32 $-nm {SOI POWER7+} processor",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "4:1--4:7",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279599",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/prng.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "hardware random-number generator; quantum thermal
                 noise; ring oscillator",
}

@Article{Jaramillo:2013:CSB,
  author =       "D. Jaramillo and N. Katz and B. Bodin and W. Tworek
                 and R. Smart and T. Cook",
  title =        "Cooperative solutions for Bring Your Own Device
                 {(BYOD)}",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "5:1--5:11",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279600",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cook:2013:MIA,
  author =       "T. Cook and D. Jaramillo and N. Katz and B. Bodin and
                 S. Cooper and C. H. Becker and R. Smart and C. Lu",
  title =        "Mobile innovation applications for the {BYOD}
                 enterprise user",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "6:1--6:10",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279637",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Castro:2013:EBY,
  author =       "P. C. Castro and J. W. Ligman and M. Pistoia and J.
                 Ponzo and G. S. Thomas and S. P. Wood and M. Baluda",
  title =        "Enabling Bring-Your-Own-Device using mobile
                 application instrumentation",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "7:1--7:11",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2279640",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Castro:2013:RAM,
  author =       "P. C. Castro and J. W. Ligman and M. Pistoia and J.
                 Ponzo and G. S. Thomas and U. Topkara",
  title =        "Runtime adaptive multi-factor authentication for
                 mobile devices",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "8:1--8:17",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2281123",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Malone:2013:MOD,
  author =       "C. V. Malone and E. J. Barkie and B. L. Fletcher and
                 N. Wei and A. Keren and A. Wyskida",
  title =        "{Mobile Optimized Digital Identity (MODI)}: A
                 framework for easier digital certificate use",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "9:1--9:11",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2283755",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sbirlea:2013:ADI,
  author =       "D. Sbirlea and M. G. Burke and S. Guarnieri and M.
                 Pistoia and V. Sarkar",
  title =        "Automatic detection of inter-application permission
                 leaks in {Android} applications",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "10:1--10:12",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2284403",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chencinski:2013:FSI,
  author =       "E. W. Chencinski and M. J. Anderson and L. Cleveland
                 and J. Coon and D. Craddock and R. E. Galbraith and T.
                 A. Gregg and T. B. Mathias and D. F. Moertl and K. J.
                 Oakes and M. Sabins and G. E. Sittmann and P. Sutton
                 and P. Szwed and G. A. Tressler and E. Tzortzatos and
                 A. D. Walls",
  title =        "Flash storage integration in the {IBM System z EC12}
                 {I/O} drawer",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "11:1--11:14",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2285294",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2013:C,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "??--??",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2013:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "??--??",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ritsko:2013:PMC,
  author =       "J. J. Ritsko",
  title =        "Preface: Mobile computing and {IBM POWER7+}
                 technologies",
  journal =      j-IBM-JRD,
  volume =       "57",
  number =       "6",
  pages =        "??--??",
  month =        nov # "--" # dec,
  year =         "2013",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:47 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ortiz-Yepes:2014:BSA,
  author =       "D. A. Ortiz-Yepes and R. J. Hermann and H. Steinauer
                 and P. Buhler",
  title =        "Bringing strong authentication and transaction
                 security to the realm of mobile devices",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "4:1--4:11",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2287810",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Visegrady:2014:SCV,
  author =       "T. Visegrady and S. Dragone and M. Osborne",
  title =        "Stateless cryptography for virtual environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "5:1--5:10",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2287811",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Whitmore:2014:TAS,
  author =       "J. Whitmore and S. Turpe and S. Triller and A. Poller
                 and C. Carlson",
  title =        "Threat analysis in the software development
                 lifecycle",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "6:1--6:13",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2288060",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kitayama:2014:ASP,
  author =       "H. Kitayama and S. Munetoh and K. Ohnishi and N.
                 Uramoto and Y. Watanabe",
  title =        "Advanced security and privacy in connected vehicles",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "7:1--7:9",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2288061",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ahmed:2014:ASA,
  author =       "M. Ahmed and M. Ahamad and T. Jaiswal",
  title =        "Augmenting security and accountability within the
                 {eHealth} Exchange",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "8:1--8:11",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2288068",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gkoulalas-Divanis:2014:TSH,
  author =       "A. Gkoulalas-Divanis and G. Loukides and J. Sun",
  title =        "Toward smarter healthcare: Anonymizing medical data to
                 support research studies",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "9:1--9:11",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2288173",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baentsch:2014:ISE,
  author =       "M. Baentsch and P. Buhler and L. Garces-Erice and T.
                 Gschwind and F. Horing and M. Kuyper and A. Schade and
                 P. Scotton and P. Urbanetz",
  title =        "{IBM Secure Enterprise Desktop}",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "10:1--10:11",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2289606",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Szakal:2014:OIS,
  author =       "A. R. Szakal and K. J. Pearsall",
  title =        "Open industry standards for mitigating risks to global
                 supply chains",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "11--113",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2285605",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gkoulalas-Divanis:2014:PPO,
  author =       "A. Gkoulalas-Divanis and P. Mac Aonghusa",
  title =        "Privacy protection in open information management
                 platforms",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "21--211",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2285853",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Himmel:2014:SDS,
  author =       "M. A. Himmel and F. Grossman",
  title =        "Security on distributed systems: Cloud security versus
                 traditional {IT}",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "31--313",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2013.2287591",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:FCa,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "??--??",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:TCa,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "??--??",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Palmer:2014:PCS,
  author =       "C. C. Palmer",
  title =        "Preface: Cybersecurity for a Smarter Planet",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "??--??",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Viveros:2014:MVP,
  author =       "M. S. Viveros",
  title =        "Message from the {Vice President, Cyber Security
                 Innovation}",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "1",
  pages =        "??--??",
  month =        jan # "--" # feb,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Feb 15 16:52:52 MST 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Li:2014:SDE,
  author =       "C. Li and B. L. Brech and S. Crowder and D. M. Dias
                 and H. Franke and M. Hogstrom and D. Lindquist and G.
                 Pacifici and S. Pappe and B. Rajaraman and J. Rao and
                 R. P. Ratnaparkhi and R. A. Smith and M. D. Williams",
  title =        "Software defined environments: An introduction",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "1:1--1:11",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2298134",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kandiraju:2014:SDI,
  author =       "G. Kandiraju and H. Franke and M. D. Williams and M.
                 Steinder and S. M. Black",
  title =        "Software defined infrastructures",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "2:1--2:13",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2298133",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dixon:2014:SDN,
  author =       "C. Dixon and D. Olshefski and V. Jain and C. DeCusatis
                 and W. Felter and J. Carter and M. Banikazemi and V.
                 Mann and J. M. Tracey and R. Recio",
  title =        "Software defined networking to support the software
                 defined environment",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "3:1--3:14",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2300365",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baset:2014:TAO,
  author =       "S. A. Baset and L. Wang and B. C. Tak and C. Pham and
                 C. Tang",
  title =        "Toward achieving operational excellence in a cloud",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "4:1--4:11",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2298927",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Alba:2014:EAS,
  author =       "A. Alba and G. Alatorre and C. Bolik and A. Corrao and
                 T. Clark and S. Gopisetty and R. Haas and R. I. Kat and
                 B. S. Langston and N. S. Mandagere and D. Noll and S.
                 Padbidri and R. Routray and Y. Song and C. Tan and A.
                 Traeger",
  title =        "Efficient and agile storage management in software
                 defined environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "5:1--5:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2302381",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Azagury:2014:GBI,
  author =       "A. C. Azagury and R. Haas and D. Hildebrand and S. W.
                 Hunter and T. Neville and S. Oehme and A. Shaikh",
  title =        "{GPFS}-based implementation of a hyperconverged system
                 for software defined infrastructure",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "6:1--6:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2303321",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Seshadri:2014:SDJ,
  author =       "S. Seshadri and P. H. Muench and L. Chiu and I.
                 Koltsidas and N. Ioannou and R. Haas and Y. Liu and M.
                 Mei and S. Blinick",
  title =        "Software defined just-in-time caching in an enterprise
                 storage system",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "7:1--7:13",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2303595",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mega:2014:DCS,
  author =       "C. Mega and T. Waizenegger and D. Lebutsch and S.
                 Schleipen and J. M. Barney",
  title =        "Dynamic cloud service topology adaption for minimizing
                 resources while meeting performance goals",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "8:1--8:10",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2304771",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Breiter:2014:SDE,
  author =       "G. Breiter and M. Behrendt and M. Gupta and S. D.
                 Moser and R. Schulze and I. Sippli and T. Spatzier",
  title =        "Software defined environments based on {TOSCA} in
                 {IBM} cloud implementations",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "9:1--9:10",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2304772",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kalantar:2014:WLR,
  author =       "M. H. Kalantar and F. Rosenberg and J. Doran and T.
                 Eilam and M. D. Elder and F. Oliveira and E. C. Snible
                 and T. Roth",
  title =        "{Weaver}: Language and runtime for software defined
                 environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "10:1--10:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2304865",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arnold:2014:WOO,
  author =       "W. C. Arnold and D. J. Arroyo and W. Segmuller and M.
                 Spreitzer and M. Steinder and A. N. Tantawi",
  title =        "Workload orchestration and optimization for software
                 defined environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "11:1--11:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2304864",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mahindru:2014:SDU,
  author =       "R. Mahindru and R. Sarkar and M. Viswanathan",
  title =        "Software defined unified monitoring and management of
                 clouds",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "12:1--12:11",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2305313",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vernizzi:2014:TCF,
  author =       "G. Vernizzi and M. Y. Lanzerotti and J. Kujawski and
                 A. Weatherwax",
  title =        "Topological constraints for {E. F. Rent}'s work on
                 microminiature packaging and circuitry",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "13:1--13:17",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2307225",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fiorelli:2014:CCA,
  author =       "M. Fiorelli and M. T. Pazienza and A. Stellato and A.
                 Turbati",
  title =        "{CODA}: Computer-aided ontology development
                 architecture",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "14:1--14:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2307518",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nguyen:2014:HBD,
  author =       "H. Nguyen and L. Michel and J. D. Thompson and O.
                 Poch",
  title =        "Heterogeneous biological data integration with
                 declarative query language",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "15:1--15:12",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2309032",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:Ca,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:Cb,
  author =       "Anonymous",
  title =        "Cover 2",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:Cc,
  author =       "Anonymous",
  title =        "Cover 3",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Franke:2014:PSD,
  author =       "H. Franke and M. Hogstrom and D. Lindquist and B.
                 McCredie and S. Pappe",
  title =        "Preface: Software defined environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "--" # may,
  year =         "2014",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Sep 9 11:20:32 MDT 2014",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:FCb,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "C1--C1",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2330427",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:FICa,
  author =       "Anonymous",
  title =        "[Front inside cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "C2--C2",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2330429",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:TCc,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "1--2",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2336432",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ray:2014:PSF,
  author =       "B. K. Ray and K. Saxton",
  title =        "Preface: Smarter finance",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "1--3",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2329385",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rios:2014:FSF,
  author =       "J. Rios and K. Anikeev and M. J. Richard and S. Kapoor
                 and B. K. Ray and C. Toft-Nielsen and D. Subramanian
                 and C. Jiang and Y. Drissi and J. Fu",
  title =        "A framework for strategic financial risk management",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "1:1--1:11",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2320833",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Computational modeling;
                 Probabilistic logic; Probability distribution; Risk
                 management; Strategic planning",
}

@Article{Horrall:2014:ERI,
  author =       "D. Horrall and Y. Siddiqui",
  title =        "Evaluating risk: {IBM}'s Country Financial Risk and
                 Treasury Risk Scorecards",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "2:1--2:9",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2321072",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Context awareness; Current measurement; Economic
                 indicators; Macroeconomics; Risk management",
}

@Article{Duch:2014:NAO,
  author =       "K. Duch and Y. Jiang and A. Kreinin",
  title =        "New approaches to operational risk modeling",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "3:1--3:9",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2321851",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Banking; Computational modeling; Economics; Finances;
                 Modeling; Poisson equations; Risk management",
}

@Article{King:2014:MFR,
  author =       "A. J. King and A. Orani and F. N. Parr",
  title =        "Middleware for financial risk data aggregation",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "4:1--4:10",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2322272",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Banking; Cost accounting; Data models; Globalization;
                 Information processing; Investment; Law; Middleware;
                 Regulators; Risk management",
}

@Article{Mausser:2014:CER,
  author =       "H. Mausser and O. Romanko",
  title =        "Computing equal risk contribution portfolios",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "5:1--5:12",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2325291",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Approximation algorithms; Computational modeling;
                 Linear programming; Portfolios; Quadratic programming;
                 Risk management",
}

@Article{Guerard:2014:REC,
  author =       "J. B. Guerard and H. Markowitz and G. Xu",
  title =        "The role of effective corporate decisions in the
                 creation of efficient portfolios",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "6:1--6:11",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2326591",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Data mining; Decision making; Finances; Investment;
                 Mathematical model; Strategic planning",
}

@Article{Vogt:2014:ASP,
  author =       "A. Vogt and E. R. Mattfeldt and G. Satzger and L.
                 Luders and M. Piper and O. Gehb and W. L. Jones",
  title =        "Analytical support for predicting cost in complex
                 service delivery environments",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "7:1--7:10",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2327301",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Data models; Forecasting;
                 Globalization; Predictive models; Risk management",
}

@Article{Lu:2014:WMR,
  author =       "Y. Lu and M. Sharma and M. S. Squillante",
  title =        "Workforce management: Risk-based financial planning
                 and capacity provisioning",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "8:1--8:10",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2327709",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Approximation methods; Capacity planning; Finance;
                 Planning; Risk management; Stochastic processes;
                 Strategic planning; Uncertainty",
}

@Article{Amemiya:2014:AER,
  author =       "Y. Amemiya and H. Yang and K. Anikeev",
  title =        "An approach to enterprise revenue forecasting as a
                 decision support system",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "9:1--9:7",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2328931",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Business; Competitive intelligence; Decision making;
                 Decision support systems; Economics; Forecasting;
                 Predictive models",
}

@Article{Albrecht:2014:SFL,
  author =       "S. Albrecht and A. Bonti and J. Dhaliwal and F. M.
                 Giaimo and J. von Kanel and S. Pandey and A. Phan and
                 Y. Wang",
  title =        "Smarter Financial Life: Rethinking personal financial
                 planning",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "10:1--10:10",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2329384",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Banking; Insurance; Investment;
                 Risk management; Strategic planning; Visualization",
}

@Article{Anonymous:2014:BICa,
  author =       "Anonymous",
  title =        "[Back inside cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "4",
  pages =        "C3--C3",
  month =        jul,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2330430",
  ISSN =         "0018-8646",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 08:50:21 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:FCc,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "C1--C1",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2358963",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:FICb,
  author =       "Anonymous",
  title =        "[Front inside cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "C2--C2",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2363987",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2014:TCd,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "1--1",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2363988",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dong:2014:PSC,
  author =       "J. Dong and R. Lougee and C. Narayanaswami",
  title =        "Preface: Smarter Commerce",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "1--5",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2359096",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Takahashi:2014:MPM,
  author =       "R. Takahashi and T. Yoshizumi and H. Mizuta and N. Abe
                 and R. L. Kennedy and V. J. Jeffs and R. Shah and R. H.
                 Crites",
  title =        "Multi-period marketing-mix optimization with response
                 spike forecasting",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "1:1--1:13",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2337131",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Budgets; Consumer behavior; Consumer purchases;
                 Decision making; Economics; Forecasting; Market
                 research; Risk assessment; Sales and marketing",
}

@Article{Sun:2014:DPC,
  author =       "W. Sun and P. Murali and A. Sheopuri and Y. Chee",
  title =        "Designing promotions: Consumers' surprise and
                 perception of discounts",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "2:1--2:10",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2337691",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Advertising; Behavioral science; Consumer behavior;
                 Consumer products; Market research; Sales and
                 marketing",
}

@Article{Yaeli:2014:UCB,
  author =       "A. Yaeli and P. Bak and G. Feigenblat and S. Nadler
                 and H. Roitman and G. Saadoun and H. J. Ship and D.
                 Cohen and O. Fuchs and S. Ofek-Koifman and T.
                 Sandbank",
  title =        "Understanding customer behavior using indoor location
                 analysis and visualization",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "3:1--3:12",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2337552",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Behavioral sciecne; Consumer behavior; Consumer
                 purchases; Electronic commerce; Market research; Mobile
                 communication; Sales and marketing; Social network
                 services",
}

@Article{Sun:2014:IFB,
  author =       "N. Sun and J. G. Morris and J. Xu and X. Zhu and M.
                 Xie",
  title =        "{iCARE}: A framework for big data-based banking
                 customer analytics",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "4:1--4:9",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2337118",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Banking industry; Big data; Data
                 models; Electronic commerce; Finance",
}

@Article{He:2014:IBR,
  author =       "M. He and C. Ren and H. Zhang",
  title =        "Intent-based recommendation for {B2C} e-commerce
                 platforms",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "5:1--5:10",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2338091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Consumer behavior; Consumer purchases; Electronic
                 commerce; Internet; Recommender systems; Sales and
                 marketing",
}

@Article{Bao:2014:PMU,
  author =       "J. Bao and A. Deshpande and S. McFaddin and C.
                 Narayanaswami",
  title =        "Partner-marketing using geo-social media data for
                 smarter commerce",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "6:1--6:12",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2344514",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Consumer behavior; Consumer products; Electronic
                 commerce; Globalization; Market opportunities; Market
                 research; Sales and marketing; Social network
                 services",
}

@Article{Buckley:2014:SMC,
  author =       "S. Buckley and M. Ettl and P. Jain and R. Luss and M.
                 Petrik and R. K. Ravi and C. Venkatramani",
  title =        "Social media and customer behavior analytics for
                 personalized customer engagements",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "7:1--7:12",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2344515",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Behavioral science; Consumer behavior; Customer
                 services; Market research; Natural language processing;
                 Social network services; Text analytics",
}

@Article{Tian:2014:PRS,
  author =       "C. H. Tian and Y. Wang and W. T. Mo and F. C. Huang
                 and W. S. Dong and J. Huang",
  title =        "Pre-release sales forecasting: A model-driven context
                 feature extraction approach",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "8:1--8:13",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2344531",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "China; Context modeling; Feature extraction;
                 Forecasting; Market research; Motion pictures; Sales
                 and marketing; Semantics; Social network services",
}

@Article{Cao:2014:SAT,
  author =       "H. Cao and W. S. Dong and L. S. Liu and C. Y. Ma and
                 W. H. Qian and J. W. Shi and C. H. Tian and Y. Wang and
                 D. Konopnicki and M. Shmueli-Scheuer and D. Cohen and
                 N. Modani and H. Lamba and A. Dwivedi and A. A.
                 Nanavati and M. Kumar",
  title =        "{SoLoMo} analytics for telco {Big Data} monetization",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "9:1--9:13",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2336177",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Algorithm design and analysis; Big data; Consumer
                 behavior; Customer services; Electronic commerce;
                 Internet; Mobile communication; Social network
                 services",
}

@Article{Desmond:2014:SAP,
  author =       "M. Desmond and H. L. Guo and F. F. Heath and S. Bao
                 and E. Khabiri and S. Krasikov and N. Modani and S.
                 Nagar and M. Ohno and H. Srinivasan and H. Takeuchi and
                 R. Vaculin and S. W. Zhao and T. Hamid",
  title =        "A social analytics platform for smarter commerce
                 solutions",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "10:1--10:14",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2346262",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Behavioral science; Consumer behavior; Customer
                 purchases; Electronic commerce; Internet; Sales and
                 marketing; Social factors",
}

@Article{Schlenker:2014:OWS,
  author =       "H. Schlenker and R. Kluge and J. Koehl",
  title =        "Optimization of the worldwide supply chain at
                 {Continental Tires}: A case study",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "11:1--11:11",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2345934",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Business; Mathematical model; Product development;
                 Sales and marketing; Strategic planning; Supply and
                 demand; Supply chain management; Tires",
}

@Article{Kawas:2014:UFT,
  author =       "B. Kawas and A. Koc and M. Laumanns and C. Lee and R.
                 Marinescu and M. Mevissen and N. Taheri and S. A. van
                 den Heever and R. Verago",
  title =        "Unified framework and toolkit for commerce
                 optimization under uncertainty",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "12:1--12:13",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2346071",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Decision making; Electronic commerce; Scheduling;
                 Strategic planning; Supply and demand; Uncertainty;
                 Visual analytics",
}

@Article{Yesudas:2014:IOD,
  author =       "M. Yesudas and G. Menon and V. Ramamurthy",
  title =        "Intelligent operational dashboards for smarter
                 commerce using big data",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "13:1--13:10",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2346131",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Big data; Business; Consumer behavior; Consumer
                 purchases; Data models; Database management; Electronic
                 commerce; Sales and marketing; Supply chain
                 management",
}

@Article{Lotlikar:2014:RTC,
  author =       "R. M. Lotlikar and P. N. Pachigolla and D.
                 Miller-Davie and S. Godbole",
  title =        "Real-time customer probing and decision support in a
                 call center",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "14:1--14:11",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2346659",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Call centers; Consumer behavior; Contact centers; Data
                 models; Market opportunities; Market research;
                 Real-time systems; Sales and marketing",
}

@Article{Jamison:2014:ACE,
  author =       "J. Jamison and C. Snow",
  title =        "An architecture for customer experience management
                 based on the {Internet of Things}",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "15:1--15:11",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2346593",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Consumer behavior; Consumer products; Customer
                 services; Electronic commerce; Internet of things;
                 Investments; Market research; Network architecture",
}

@Article{Yesudas:2014:CBM,
  author =       "M. Yesudas and S. Gupta and H. Ramamurthy",
  title =        "Cloud-based mobile commerce for grocery purchasing in
                 developing countries",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "16:1--16:7",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2352471",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Business; Cloud computing; Consumer behavior;
                 Electronic commerce; Handheld devices; Market
                 opportunities; Mobile communication; Sales and
                 marketing; Smart phones",
}

@Article{Ram:2014:OSI,
  author =       "R. Ram and Y. Peres",
  title =        "Online shop for integrated software, hardware, and
                 human services",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "17:1--17:10",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2352473",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Economics; Europe; Integrated services; Internet;
                 Market research; Online services; Social factors;
                 Social network services",
}

@Article{OSullivan:2014:ADM,
  author =       "P. O'Sullivan and G. Thompson and A. Clifford",
  title =        "Applying data models to big data architectures",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "18:1--18:11",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2352474",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Big data; Business; Data models; Database management;
                 Transaction processing",
}

@Article{Rojahn:2014:TCW,
  author =       "T. Rojahn and R. Lebsack and C. Pavlovski",
  title =        "Toward a computing workload classifier",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "19:1--19:12",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2352491",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Business; Computers; Information technology; Internet;
                 Market research; Mobile communication; Technology
                 forecasting; Ubiquitous computing",
}

@Article{Anonymous:2014:BICb,
  author =       "Anonymous",
  title =        "[back inside cover]",
  journal =      j-IBM-JRD,
  volume =       "58",
  number =       "5/6",
  pages =        "C3--C3",
  month =        sep,
  year =         "2014",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2014.2363989",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jan 29 07:46:48 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sinharoy:2015:AFI,
  author =       "B. Sinharoy and R. Swanberg and N. Nayar and B. Mealey
                 and J. Stuecheli and B. Schiefer and J. Leenstra and J.
                 Jann and P. Oehler and D. Levitan and S. Eisen and D.
                 Sanner and T. Pflueger and C. Lichtenau and W. E. Hall
                 and T. Block",
  title =        "Advanced features in {IBM POWER8} systems",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "1:1--1:18",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:TCa,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "1--2",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pattnaik:2015:PIP,
  author =       "P. Pattnaik and J. Moreira and D. W. Victor",
  title =        "Preface: {IBM POWER8} technology",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "1--4",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sinharoy:2015:IPP,
  author =       "B. Sinharoy and J. A. {Van Norstrand} and R. J.
                 Eickemeyer and H. Q. Le and J. Leenstra and D. Q.
                 Nguyen and B. Konigsburg and K. Ward and M. D. Brown
                 and J. E. Moreira and D. Levitan and S. Tung and D.
                 Hrusecky and J. W. Bishop and M. Gschwind and M.
                 Boersma and M. Kroener and M. Kaltenbach and T.
                 Karkhanis and K. M. Fernsler",
  title =        "{IBM POWER8} processor core microarchitecture",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "2:1--2:21",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Starke:2015:CMS,
  author =       "W. J. Starke and J. Stuecheli and D. M. Daly and J. S.
                 Dodson and F. Auernhammer and P. M. Sagmeister and G.
                 L. Guthrie and C. F. Marino and M. Siegel and B.
                 Blaner",
  title =        "The cache and memory subsystems of the {IBM POWER8}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "3:1--3:13",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cahill:2015:IPS,
  author =       "J. J. Cahill and T. Nguyen and M. Vega and D. Baska
                 and D. Szerdi and H. Pross and R. X. Arroyo and H.
                 Nguyen and M. J. Mueller and D. J. Henderson and J.
                 Moreira",
  title =        "{IBM Power Systems} built with the {POWER8}
                 architecture and processors",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "4:1--4:10",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Freeman:2015:POG,
  author =       "G. Freeman and P. Chang and E. R. Engbrecht and K. J.
                 Giewont and D. F. Hilscher and M. Lagus and T. J.
                 McArdle and B. Morgenfeld and S. Narasimha and J. P.
                 Norum and K. A. Nummy and P. Parries and G. Wang and J.
                 K. Winslow and P. Agnello and R. Malik",
  title =        "Performance-optimized gate-first $ 22$-nm {SOI}
                 technology with embedded {DRAM}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "5:1--5:14",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mericas:2015:IPP,
  author =       "A. Mericas and N. Peleg and L. Pesantez and S. B.
                 Purushotham and P. Oehler and C. A. Anderson and B. A.
                 King-Smith and M. Anand and J. A. Arnold and B. Rogers
                 and L. Maurice and K. Vu",
  title =        "{IBM POWER8} performance features and evaluation",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "6:1--6:10",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stuecheli:2015:CCA,
  author =       "J. Stuecheli and B. Blaner and C. R. Johns and M. S.
                 Siegel",
  title =        "{CAPI}: A {Coherent Accelerator Processor Interface}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "7:1--7:7",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Le:2015:TMS,
  author =       "H. Q. Le and G. L. Guthrie and D. E. Williams and M.
                 M. Michael and B. G. Frey and W. J. Starke and C. May
                 and R. Odaira and T. Nakaike",
  title =        "Transactional memory support in the {IBM POWER8}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "8:1--8:14",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zyuban:2015:IPC,
  author =       "V. Zyuban and J. Friedrich and D. M. Dreps and J.
                 Pille and D. W. Plass and P. J. Restle and Z. T. Deniz
                 and M. M. Ziegler and S. Chu and S. Islam and J.
                 Warnock and R. Philhower and R. M. Rao and G. S. Still
                 and D. W. Shan and E. Fluhr and J. Paredes and D. F.
                 Wendel and C. J. Gonzalez and D. Hogenmiller and R.
                 Puri and S. A. Taylor and S. D. Posluszny",
  title =        "{IBM POWER8} circuit design and energy optimization",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "9:1--9:16",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Raghavan:2015:IPP,
  author =       "R. Raghavan and R. J. Eickemeyer and A. C. Sawdey and
                 J. B. Griswell and D. Parikh and S. Ramani and D. M.
                 Daly and N. Ni and B. Rogers and A. Mericas and L.
                 Maurice and K. Vu",
  title =        "{IBM POWER8} performance and energy modeling",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "10:1--10:10",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schubert:2015:SIP,
  author =       "K. Schubert and J. M. Ludden and S. Ayub and J.
                 Behrend and B. Brock and F. Copty and S. M. German and
                 O. Hershkovitz and H. Horbach and J. R. Jackson and K.
                 Keuerleber and J. Koesters and L. S. Leitner and G. B.
                 Meil and C. Meissner and R. Morad and A. Nahir and V.
                 Paruthi and R. D. Peterson and R. R. Pratt and M. Rimon
                 and J. A. Schumann",
  title =        "Solutions to {IBM POWER8} verification challenges",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "11:1--11:17",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dusanapudi:2015:DPS,
  author =       "M. Dusanapudi and S. Fields and M. S. Floyd and G. L.
                 Guthrie and R. Kalla and S. Kapoor and L. S. Leitner
                 and C. F. Marino and J. J. McGill and A. Nahir and K.
                 Reick and H. Shen and K. L. Wright",
  title =        "Debugging post-silicon fails in the {IBM POWER8}
                 bring-up lab",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "12:1--12:10",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:BIC,
  author =       "Anonymous",
  title =        "[Back inside cover]",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "c3--c3",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:FCa,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "c1--c1",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:FIC,
  author =       "Anonymous",
  title =        "[Front inside cover]",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "1",
  pages =        "c2--c2",
  month =        jan # "\slash " # feb,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Mar 6 16:48:56 MST 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Abedini:2015:GFM,
  author =       "M. Abedini and N. C. F. Codella and J. H. Connell and
                 R. Garnavi and M. Merler and S. Pankanti and J. R.
                 Smith and T. Syeda-Mahmood",
  title =        "A generalized framework for medical image
                 classification and recognition",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "1:1--1:18",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:TCb,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "1--2",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Soffer:2015:PMV,
  author =       "A. Soffer and H. Su",
  title =        "Preface: Multimedia and visual analytics",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "1--5",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kisilev:2015:MIA,
  author =       "P. Kisilev and E. Walach and E. Barkan and B. Ophir
                 and S. Alpert and S. Y. Hashoul",
  title =        "From medical image to automatic medical report
                 generation",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "2:1--2:7",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Marder:2015:UIA,
  author =       "M. Marder and S. Harary and A. Ribak and Y. Tzur and
                 S. Alpert and A. Tzadok",
  title =        "Using image analytics to monitor retail store
                 shelves",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "3:1--3:11",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ratha:2015:BDA,
  author =       "N. K. Ratha and J. H. Connell and S. Pankanti",
  title =        "{Big Data} approach to biometric-based identity
                 analytics",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "4:1--4:11",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lin:2015:MCA,
  author =       "C. Lin and S. Pankanti and G. Ashour and D. Porat and
                 J. R. Smith",
  title =        "Moving camera analytics: Emerging scenarios,
                 challenges, and applications",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "5:1--5:10",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Su:2015:LFB,
  author =       "F. Su and W. Jiang and J. Zhang and H. Wang and M.
                 Zhang",
  title =        "A local features-based approach to all-sky image
                 prediction",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "6:1--6:10",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Smith:2015:MSL,
  author =       "J. R. Smith and L. Cao and N. C. F. Codella and M. L.
                 Hill and M. Merler and Q. Nguyen and E. Pring and R. A.
                 Uceda-Sosa",
  title =        "Massive-scale learning of image and video semantic
                 concepts",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "7:1--7:13",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chang:2015:FDI,
  author =       "H. Chang and I. H. Jiang and H. P. Hofstee and D.
                 Jamsek and G. Nam",
  title =        "Feature detection for image analytics via {FPGA}
                 acceleration",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "8:1--8:10",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Andreopoulos:2015:VSN,
  author =       "A. Andreopoulos and B. Taba and A. S. Cassidy and R.
                 Alvarez-Icaza and M. D. Flickner and W. P. Risk and A.
                 Amir and P. A. Merolla and J. V. Arthur and D. J. Berg
                 and J. A. Kusnitz and P. Datta and S. K. Esser and R.
                 Appuswamy and D. R. Barch and D. S. Modha",
  title =        "Visual saliency on networks of neurosynaptic cores",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "9:1--9:16",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bak:2015:VAM,
  author =       "P. Bak and H. J. Ship and A. Yaeli and Y. Nardi and E.
                 Packer and G. Saadoun and J. Bnayahu and L.
                 Peterfreund",
  title =        "Visual analytics for movement behavior in traffic and
                 transportation",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "10:1--10:12",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Erickson:2015:SCC,
  author =       "T. Erickson and J. B. Ellis and K. P. McAuliffe",
  title =        "Supporting coordinated care: Designing social context
                 visualizations for care teams",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "11:1--11:11",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kandogan:2015:JTI,
  author =       "E. Kandogan",
  title =        "Just-in-time interactive analytics: Guiding visual
                 exploration of data",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "12:1--12:10",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Borrel:2015:VID,
  author =       "P. Borrel and B. Laha",
  title =        "Visual Integration: A dynamic approach to the
                 interactive combination of disparate data",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "13:1--13:12",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dunne:2015:RMF,
  author =       "C. Dunne and S. I. Ross and B. Shneiderman and M.
                 Martino",
  title =        "Readability metric feedback for aiding node-link
                 visualization designers",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "14:1--14:16",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{DAmora:2015:DCA,
  author =       "B. D'Amora and G. C. Fossum",
  title =        "A data-centric algorithm for automated detection and
                 extraction of isoparametric surfaces",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "15:1--15:8",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cavalin:2015:SAR,
  author =       "P. R. Cavalin and M. A. C. Gatti and T. G. P. Moraes
                 and F. S. Oliveira and C. S. Pinhanez and A. Rademaker
                 and R. A. de Paula",
  title =        "A scalable architecture for real-time analysis of
                 microblogging data",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "16:1--16:10",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nair:2015:AMC,
  author =       "R. Nair and S. F. Antao and C. Bertolli and P. Bose
                 and J. R. Brunheroto and T. Chen and C. Cher and C. H.
                 A. Costa and J. Doi and C. Evangelinos and B. M.
                 Fleischer and T. W. Fox and D. S. Gallo and L. Grinberg
                 and J. A. Gunnels and A. C. Jacob and P. Jacob and H.
                 M. Jacobson and T. Karkhanis and C. Kim and J. H.
                 Moreno and J. K. O'Brien and M. Ohmacht and Y. Park and
                 D. A. Prener and B. S. Rosenburg and K. D. Ryu and O.
                 Sallenave and M. J. Serrano and P. D. M. Siegl and K.
                 Sugavanam and Z. Sura",
  title =        "{Active Memory Cube}: A processing-in-memory
                 architecture for exascale systems",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "17:1--17:14",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:FCb,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "2--3",
  pages =        "C1",
  month =        mar # "\slash " # may,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sun Aug 9 17:17:56 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Curran:2015:IZM,
  author =       "B. W. Curran and C. Jacobi and J. J. Bonanno and D. A.
                 Schroter and K. J. Alexander and A. Puranik and M. M.
                 Helms",
  title =        "The {IBM z13} multithreaded microprocessor",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "1:1--1:13",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2418591",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/multithreading.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:TCc,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "1--2",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 21 11:38:12 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kostenko:2015:PIZ,
  author =       "W. P. Kostenko",
  title =        "Preface: {IBM z13} Technology and Design",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "1--4",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2446873",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schwarz:2015:SAB,
  author =       "E. M. Schwarz and R. B. Krishnamurthy and C. J. Parris
                 and J. D. Bradbury and I. M. Nnebe and M. Gschwind",
  title =        "The {SIMD} accelerator for business analytics on the
                 {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "2:1--2:16",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2426576",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Walters:2015:IZP,
  author =       "C. R. Walters and P. Mak and D. P. D. Berger and M. A.
                 Blake and T. C. Bronson and K. D. Klapproth and A. J.
                 O'Neill and R. J. Sonnelitter and V. K. Papazova",
  title =        "The {IBM z13} processor cache subsystem",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "3:1--3:14",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2428591",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meaney:2015:IZM,
  author =       "P. J. Meaney and L. D. Curley and G. D. Gilda and M.
                 R. Hodges and D. J. Buerkle and R. D. Siegl and R. K.
                 Dong",
  title =        "The {IBM z13} memory subsystem for big data",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "4:1--4:11",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2429031",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chencinski:2015:AIZ,
  author =       "E. W. Chencinski and C. Colonna and D. Craddock and J.
                 R. Flanagan and J. M. Hoke and M. Klein and G. Kuch and
                 P. Sciuto and R. M. Sczepczenski and H. M.
                 Yudenfriend",
  title =        "Advances in the {IBM z13} {I/O} function and
                 capability",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "5:1--5:10",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2429032",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arnold:2015:NGH,
  author =       "T. W. Arnold and M. Check and E. A. Dames and J. Dayka
                 and S. Dragone and D. Evans and W. Santiago Fernandez
                 and M. D. Hocker and R. Kisley and T. E. Morris and J.
                 Petreshock and K. Werner",
  title =        "The next generation of highly reliable and secure
                 encryption for the {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "6:1--6:13",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2430071",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sofia:2015:IHP,
  author =       "A. T. Sofia and C. C. Lewis and C. Jacobi and D. A.
                 Jamsek and D. F. Riedy and J. Vogt and P. Sutton and R.
                 W. {St. John}",
  title =        "Integrated high-performance data compression in the
                 {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "7:1--7:10",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2430091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Surman:2015:IZS,
  author =       "D. H. Surman",
  title =        "The {IBM z Systems Coupling Facility} exploitation of
                 storage-class memory",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "8:1--8:9",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2430052",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Clarke:2015:ARA,
  author =       "W. J. Clarke and L. C. Alves and K. W. Kark and R. K.
                 Overton and M. J. Snihur",
  title =        "Advancing reliability, availability, and
                 serviceability with the {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "9:1--9:11",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2432651",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kostenko:2015:IZE,
  author =       "W. P. Kostenko and D. W. Demetriou and G. F. Goth",
  title =        "{IBM z13}: Energy efficiency, increased environmental
                 range, and flexible data center characteristics",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "10:1--10:9",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2432652",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Axnix:2015:IZF,
  author =       "C. Axnix and G. Bayer and H. Bohm and J. von Buttlar
                 and M. S. Farrell and L. C. Heller and J. P. Kubala and
                 S. E. Lederer and R. Mansell and A. Nunez Mencias and
                 S. Usenbinz",
  title =        "{IBM z13} firmware innovations for simultaneous
                 multithreading and {I/O} virtualization",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "11:1--11:11",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2435494",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 21 11:38:12 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/multithreading.bib;
                 https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Troester:2015:IIF,
  author =       "M. Troester and P. J. Clas and M. Kuenzel and I.
                 Leoshkevich and P. Schulz and B. D. Valentine and M.
                 Becht and V. Gorbik and P. M. Lobo and O. Marquardt and
                 S. Stork and T. Webel",
  title =        "Innovations in infrastructure firmware for the {IBM
                 z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "12:1--12:11",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2444733",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Becker:2015:EPI,
  author =       "W. D. Becker and H. Harrer and A. Huber and W. L.
                 Brodsky and R. Krabbenhoft and M. A. Cracraft and D.
                 Kaller and G. Edlund and T. Strach",
  title =        "Electronic packaging of the {IBM z13} processor
                 drawer",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "13:1--13:12",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2445031",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Torok:2015:MPP,
  author =       "J. G. Torok and F. E. Bosco and G. F. Goth and J. J.
                 Loparco and M. Peets and D. Porter and S. G. Shevach
                 and B. C. Tucker and A. C. VanDeventer and X. Wei and
                 P. A. Wendling and Y. Yu and R. J. Zoodsma",
  title =        "Mechanical packaging, power, and cooling design for
                 the {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "14:1--14:15",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2446031",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Warnock:2015:IZC,
  author =       "J. Warnock and C. Berry and M. H. Wood and L. Sigal
                 and Y. Chan and G. Mayer and M. Mayo and Y. Chan and F.
                 Malgioglio and G. Strevig and C. Nagarajan and S. Carey
                 and G. Salem and F. Schroeder and H. H. Smith and D.
                 Phan and R. H. Nigaglioni and T. Strach and M. M.
                 Ziegler and N. Fricke and K. Lind and J. L. Neves and
                 S. H. Rangarajan and J. P. Surprise and J. M. Isakson
                 and J. Badar and D. Malone and D. W. Plass and A.
                 Aipperspach and D. F. Wendel and R. M. Averill and R.
                 Puri",
  title =        "{IBM z13} circuit design and methodology",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "15:1--15:15",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2446871",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webel:2015:RPM,
  author =       "T. Webel and P. M. Lobo and R. Bertran and G. M. Salem
                 and M. Allen-Ware and R. Rizzolo and S. M. Carey and T.
                 Strach and A. Buyuktosunoglu and C. Lefurgy and P. Bose
                 and R. Nigaglioni and T. Slegel and M. S. Floyd and B.
                 W. Curran",
  title =        "Robust power management in the {IBM z13}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "16:1--16:12",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2446872",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:FCc,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "4--5",
  pages =        "c1--c1",
  month =        jul # "\slash " # sep,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Oct 21 11:38:12 MDT 2015",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Basson:2015:PTE,
  author =       "S. Basson and S. V. Nitta and B. Sengupta",
  title =        "Preface: Technologies for Educational Transformation",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "0:1--0.4",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:33:24 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Neti:2015:MIE,
  author =       "C. Neti and M. Naghshineh and K. Frase",
  title =        "Message from {IBM Executives} on {``Technologies for
                 Educational Transformation''}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "0:1--0:2",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:33:24 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Koch:2015:AAC,
  author =       "F. L. Koch and M. D. de Assuncao and C. H. Cardonha
                 and M. A. S. Netto and T. T. Primo",
  title =        "An architecture and algorithm for context-aware
                 resource allocation for digital teaching platforms",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "1:1--1:9",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2452783",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:TC,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "1--2",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:33:24 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cardonha:2015:TPS,
  author =       "C. H. Cardonha and R. L. Guimaraes and A. Mattos and
                 J. Nogima and P. Avegliano and D. Gallo and R. Herrmann
                 and S. Borger",
  title =        "Toward a platform to support vocational training of
                 people with disabilities",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "2:1--2:7",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2453021",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Contractor:2015:SLC,
  author =       "D. Contractor and S. Negi and K. Popat and S. Ikbal
                 and B. Prasad and S. Vedula and S. Kakaraparthy and B.
                 Sengupta and V. Kumar",
  title =        "Smarter learning content management using the
                 {Learning Content Hub}",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "3:1--3:9",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2455691",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reddy:2015:PLP,
  author =       "V. K. Reddy and L. Said and B. Sengupta and M. Chetlur
                 and J. P. Costantino and A. Gopinath and S. Flynt and
                 P. Balunaini and S. Vedula",
  title =        "{Personalized Learning Pathways}: Enabling
                 intervention creation and tracking",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "4:1--4:14",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2456711",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ikbal:2015:EPR,
  author =       "S. Ikbal and A. Tamhane and B. Sengupta and M. Chetlur
                 and S. Ghosh and J. Appleton",
  title =        "On early prediction of risks in academic performance
                 for students",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "5:1--5:14",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2458631",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Codish:2015:DPE,
  author =       "D. Codish and G. Ravid",
  title =        "Detecting playfulness in educational gamification
                 through behavior patterns",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "6:1--6:14",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2459651",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rafaeli:2015:NSD,
  author =       "S. Rafaeli and C. Kent",
  title =        "Network-structured discussions for collaborative
                 concept mapping and peer learning",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "7:1--7:13",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2461091",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mutahi:2015:SBL,
  author =       "J. Mutahi and O. Bent and A. Kinai and K. Weldemariam
                 and B. Sengupta and D. Contractor",
  title =        "Seamless blended learning using the {Cognitive
                 Learning Companion}: A systemic view",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "8:1--8:13",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2463591",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Woolf:2015:MES,
  author =       "B. Park Woolf and I. Arroyo",
  title =        "A mentor for every student: One challenge for
                 instructional software",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "9:1--9:13",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2463611",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sundararajan:2015:DEI,
  author =       "S. C. Sundararajan and S. V. Nitta",
  title =        "Designing engaging intelligent tutoring systems in an
                 age of cognitive computing",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "10:1--10:9",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2464085",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:Ca,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "??--??",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:33:24 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:Cb,
  author =       "Anonymous",
  title =        "Cover 2",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "??--??",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:33:24 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2015:Cc,
  author =       "Anonymous",
  title =        "Cover 3",
  journal =      j-IBM-JRD,
  volume =       "59",
  number =       "6",
  pages =        "??--??",
  month =        nov # "\slash " # dec,
  year =         "2015",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 08:30:50 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Singhee:2016:PNG,
  author =       "A. Singhee and U. Finkler and S. Hirsch and M. A.
                 Lavin and F. Heng and A. P. Kumar and J. M. Qu and E.
                 Pelletier",
  title =        "A platform for the next generation of smarter energy
                 applications",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "1:1--1:15",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2482318",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "1--2",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Heng:2016:IAS,
  author =       "F. Heng and K. Zhang and A. Goyal and H. Chaudhary and
                 S. Hirsch and Y. Kim and M. A. Lavin and A. Raman",
  title =        "Integrated analytics system for electric industry
                 asset management",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "2:1--2:12",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2475955",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Reinprecht:2016:EEE,
  author =       "N. B. Reinprecht and G. White and M. Peters",
  title =        "Enabling {European} electrical transmission and
                 distribution smart grids by standards",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "3:1--3:11",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2482878",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Goyal:2016:AHM,
  author =       "A. Goyal and E. Aprilia and G. Janssen and Y. Kim and
                 T. Kumar and R. Mueller and D. Phan and A. Raman and J.
                 Schuddebeurs and J. Xiong and R. Zhang",
  title =        "Asset health management using predictive and
                 prescriptive analytics for the electric power grid",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "4:1--4:14",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2475935",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Treinish:2016:ECM,
  author =       "L. A. Treinish and J. P. Cipriani and A. Praino and A.
                 Singhee and H. Wang and M. Sinn and V. Lonij and J.
                 Fiot and B. Chen",
  title =        "Enabling coupled models to predict the business impact
                 of weather on electric utilities",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "5:1--5:10",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2489478",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Singhee:2016:OPE,
  author =       "A. Singhee and Z. Li and A. Koc and H. Wang and J. P.
                 Cipriani and Y. Kim and A. P. Kumar and L. A. Treinish
                 and R. Mueller and G. Labut and R. A. Foltman and G. M.
                 Gauthier",
  title =        "{OPRO}: Precise emergency preparedness for electric
                 utilities",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "6:1--6:15",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2494999",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Khabibrakhmanov:2016:USE,
  author =       "I. Khabibrakhmanov and S. Lu and H. F. Hamann and K.
                 Warren",
  title =        "On the usefulness of solar energy forecasting in the
                 presence of asymmetric costs of errors",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "7:1--7:6",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2495001",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Warren:2016:MUE,
  author =       "K. Warren and R. Ambrosio and B. Chen and Y. H. Fu and
                 S. Ghosh and D. Phan and M. Sinn and C. H. Tian and C.
                 Visweswariah",
  title =        "Managing uncertainty in electricity generation and
                 demand forecasting",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "8:1--8:13",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2496822",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Katz:2016:SEP,
  author =       "J. S. Katz and P. G. Allor and S. A. Dougherty and S.
                 P. Duffy and S. Riccetti and H. D. Chantz and M. Kisch
                 and B. S. Oxford and J. L. Snowdon",
  title =        "Securing the electric power infrastructure",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "9:1--9:13",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2498819",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Basu:2016:SAE,
  author =       "C. Basu and M. Padmanaban and S. Guillon and L.
                 Cauchon and M. {De Montigny} and I. Kamwa",
  title =        "Situational awareness for the electrical power grid",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "10:1--10:11",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2498818",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kim:2016:AUC,
  author =       "Y. Kim and A. Aravkin and H. Fei and A. Zondervan and
                 M. Wolf",
  title =        "Analytics for understanding customer behavior in the
                 energy and utility industry",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "11:1--11:13",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2503988",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:Ca,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "1",
  pages =        "??--??",
  month =        jan # "\slash " # feb,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Jan 19 07:54:29 MST 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Isci:2016:PMC,
  author =       "C. Isci and V. Salapura and M. Vukovic",
  title =        "Preface: Managed cloud services",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "0:1--0:4",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hwang:2016:AOF,
  author =       "J. Hwang and K. Bai and M. Tacci and M. Vukovic and N.
                 Anerousis",
  title =        "Automation and orchestration framework for large-scale
                 enterprise cloud migration",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "1:1--1:12",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2511810",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:TCb,
  author =       "Anonymous",
  title =        "Table of contents",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "1--2",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:2016:ASC,
  author =       "H. Chen and A. Turk and S. S. Duri and C. Isci and A.
                 K. Coskun",
  title =        "Automated system change discovery and management in
                 the cloud",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "2:1--2:10",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2511811",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Salapura:2016:EEL,
  author =       "V. Salapura and R. Mahindru",
  title =        "Enabling enterprise-level workloads in the
                 enterprise-class cloud",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "3:1--3:8",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2513719",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Beaty:2016:MSA,
  author =       "K. A. Beaty and J. M. Chow and R. L. F. Cunha and K.
                 K. Das and M. F. Hulber and A. Kundu and V. Michelini
                 and E. R. Palmer",
  title =        "Managing sensitive applications in the public cloud",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "4:1--4:13",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2513720",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Almasi:2016:TBH,
  author =       "G. Alm{\'a}si and J. G. Casta{\~n}os and H. Franke and
                 M. A. L. Silva",
  title =        "Toward building highly available and scalable
                 {OpenStack} clouds",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "5:1--5:10",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2015.2513721",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cash:2016:MII,
  author =       "S. Cash and V. Jain and L. Jiang and A. Karve and J.
                 Kidambi and M. Lyons and T. Mathews and S. Mullen and
                 M. Mulsow and N. Patel",
  title =        "Managed infrastructure with {IBM Cloud OpenStack
                 Services}",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "6:1--6:12",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2515418",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gheith:2016:IBM,
  author =       "A. Gheith and R. Rajamony and P. Bohrer and K. Agarwal
                 and M. Kistler and B. L. White Eagle and C. A.
                 Hambridge and J. B. Carter and T. Kaplinger",
  title =        "{IBM} Bluemix Mobile Cloud Services",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "7:1--7:12",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2515422",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kim:2016:BSS,
  author =       "M. Kim and A. Mohindra and V. Muthusamy and R. Ranchal
                 and V. Salapura and A. Slominski and R. Khalaf",
  title =        "Building scalable, secure, multi-tenant cloud services
                 on {IBM Bluemix}",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "8:1--8:12",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2516942",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arnold:2016:BIC,
  author =       "B. Arnold and S. A. Baset and P. Dettori and M.
                 Kalantar and I. I. Mohomed and S. J. Nadgowda and M.
                 Sabath and S. R. Seelam and M. Steinder and M.
                 Spreitzer and A. S. Youssef",
  title =        "Building the {IBM} Containers cloud service",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "9:1--9:12",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2516943",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Oliveira:2016:DSA,
  author =       "F. Oliveira and T. Eilam and P. Nagpurkar and C. Isci
                 and M. Kalantar and W. Segmuller and E. Snible",
  title =        "Delivering software with agility and quality in a
                 cloud environment",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "10:1--10:11",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2517498",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Suneja:2016:TAC,
  author =       "S. Suneja and C. Isci and R. Koller and E. de Lara",
  title =        "Touchless and always-on cloud analytics as a service",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "11:1--11:10",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2518438",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wittern:2016:AHG,
  author =       "E. Wittern and V. Muthusamy and J. A. Laredo and M.
                 Vukovic and A. Slominski and S. Rajagopalan and H.
                 Jamjoom and A. Natarajan",
  title =        "{API Harmony}: Graph-based search and selection of
                 {APIs} in the cloud",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "12:1--12:11",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2518818",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Diao:2016:SAI,
  author =       "Y. Diao and E. Jan and Y. Li and D. Rosu and A.
                 Sailer",
  title =        "Service analytics for {IT} service management",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "13:1--13:17",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2520620",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gschwind:2016:WAI,
  author =       "M. Gschwind",
  title =        "Workload acceleration with the {IBM POWER}
                 vector-scalar architecture",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "14:1--14:18",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2527418",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arnold:2016:MME,
  author =       "M. Arnold and D. Grove and B. Herta and M. Hind and M.
                 Hirzel and A. Iyengar and L. Mandel and V. A. Saraswat
                 and A. Shinnar and J. Sim{\'e}on and M. Takeuchi and O.
                 Tardieu and W. Zhang",
  title =        "{META}: Middleware for Events, Transactions, and
                 Analytics",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "15:1--15:10",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2527419",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:FC,
  author =       "Anonymous",
  title =        "[Front cover]",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "2--3",
  pages =        "??--??",
  month =        mar # "\slash " # may,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Apr 5 07:02:20 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rao:2016:PSI,
  author =       "J. R. Rao",
  title =        "Preface: Security intelligence",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "0:1--0:5",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rao:2016:SES,
  author =       "J. R. Rao and S. N. Chari and D. Pendarakis and R.
                 Sailer and M. Ph. Stoecklin and W. Teiken and A.
                 Wespi",
  title =        "Security $ 360^\circ $: Enterprise security for the
                 cognitive era",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "1:1--1:13",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2556958",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523350/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "1--2",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Park:2016:DCS,
  author =       "Y. Park and W. Teiken and J. R. Rao and S. N. Chari",
  title =        "Data classification and sensitivity estimation for
                 critical asset discovery",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "2:1--2:12",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2557638",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523364/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schales:2016:SAD,
  author =       "D. L. Schales and J. Jang and T. Wang and X. Hu and D.
                 Kirat and B. Wuest and M. Ph. Stoecklin",
  title =        "Scalable analytics to detect {DNS} misuse for
                 establishing stealthy communication channels",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "3:1--3:14",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2557639",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523348/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vu:2016:FCS,
  author =       "L. Vu and P. Nguyen and D. Turaga",
  title =        "Firstfilter: A cost-sensitive approach to malicious
                 {URL} detection in large-scale enterprise networks",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "4:1--4:10",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2558018",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523343/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Aharoni:2016:IMA,
  author =       "E. Aharoni and R. Peleg and S. Regev and T. Salman",
  title =        "Identifying malicious activities from system execution
                 traces",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "5:1--5:7",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2559358",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523355/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hu:2016:SMC,
  author =       "X. Hu and J. Jang and T. Wang and Z. Ashraf and M. Ph.
                 Stoecklin and D. Kirat",
  title =        "Scalable malware classification with multifaceted
                 content features and threat intelligence",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "6:1--6:11",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2559378",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523365/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chari:2016:PAU,
  author =       "S. N. Chari and T. A. Habeck and I. Molloy and Y. Park
                 and J. R. Rao and W. Teiken",
  title =        "A platform and analytics for usage and entitlement
                 analytics",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "7:1--7:12",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2560558",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523361/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coden:2016:UIT,
  author =       "A. Coden and W. S. Lin and K. Houck and M. Tanenblatt
                 and J. Boston and J. E. MacNaught and D. Soroker and J.
                 D. Weisz and S. Pan and J.-H. -H. Lai and J. Lu and S.
                 Wood and Y. Xia and C.-Y. -Y. Lin",
  title =        "Uncovering insider threats from the digital footprints
                 of individuals",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "8:1--8:11",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2568538",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523357/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stoecklin:2016:PSI,
  author =       "M. Ph. Stoecklin and K. Singh and L. Koved and X. Hu
                 and S. N. Chari and J. R. Rao and P.-C. Cheng and M.
                 Christodorescu and R. Sailer and D. L. Schales",
  title =        "Passive security intelligence to analyze the security
                 risks of mobile\slash {BYOD} activities",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "9:1--9:13",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2569858",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523356/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berger:2016:CLN,
  author =       "S. Berger and Y. Chen and X. Hu and D. Pendarakis and
                 J. R. Rao and R. Sailer and D. L. Schales and M. Ph.
                 Stoecklin",
  title =        "Closing the loop: Network and in-host monitoring
                 tandem for comprehensive cloud security visibility",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "10:1--10:12",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2571580",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523362/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berger:2016:SIC,
  author =       "S. Berger and S. Garion and Y. Moatti and D. Naor and
                 D. Pendarakis and A. Shulman-Peleg and J. R. Rao and E.
                 Valdez and Y. Weinsberg",
  title =        "Security intelligence for cloud management
                 infrastructures",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "11:1--11:13",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2572462",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523359/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Barlev:2016:SYU,
  author =       "S. Barlev and Z. Basil and S. Kohanim and R. Peleg and
                 S. Regev and A. Shulman-Peleg",
  title =        "Secure yet usable: Protecting servers and {Linux}
                 containers",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "12:1--12:10",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2574138",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/linux.bib;
                 https://www.math.utah.edu/pub/tex/bib/unix.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523363/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Amrein:2016:SII,
  author =       "A. Amrein and V. Angeletti and A. Beitler and M.
                 N{\'e}met and M. Reiser and S. Riccetti and M. Ph.
                 Stoecklin and A. Wespi",
  title =        "Security intelligence for industrial control systems",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "13:1--13:12",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2575698",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523351/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gkoulalas-Divanis:2016:ISI,
  author =       "A. Gkoulalas-Divanis and S. Braghin",
  title =        "{IPV}: A system for identifying privacy
                 vulnerabilities in datasets",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "14:1--14:10",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2576818",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7523360/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:Cb,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "4",
  pages =        "??--??",
  month =        jul # "\slash " # aug,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Helander:2016:PFS,
  author =       "M. Helander and A. Topol",
  title =        "Preface: Food Safety, Security, and Defense",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "0:1--0:3",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Weimer:2016:DFM,
  author =       "B. C. Weimer and D. B. Storey and C. A. Elkins and R.
                 C. Baker and P. Markwell and D. D. Chambliss and S. B.
                 Edlund and J. H. Kaufman",
  title =        "Defining the food microbiome for authentication,
                 safety, and process management",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "1:1--1:13",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2582598",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580718/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:TCd,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "1--2",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Edlund:2016:DMC,
  author =       "S. B. Edlund and K. L. Beck and N. Haiminen and L. P.
                 Parida and D. B. Storey and B. C. Weimer and J. H.
                 Kaufman and D. D. Chambliss",
  title =        "Design of the {MCAW} compute service for food safety
                 bioinformatics",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "2:1--2:12",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2584798",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580716/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bergeron:2016:RRR,
  author =       "J. G. Bergeron and E. M. Mann and M. W. Farnham and S.
                 Kennedy and K. Everstine and O.-O. Prasarnphanich and
                 K. Smith and W. B. Karesh and D. A. Travis and A.
                 Kircher",
  title =        "Rapid-response risk evaluation of {Ebola} spread via
                 the food system",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "3:1--3:12",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2585778",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580679/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Natarajan:2016:MEM,
  author =       "R. Natarajan and R. C. Baker and R. M. Ford and M. E.
                 Helander and J. Marecki and B. K. Ray",
  title =        "Mixed-effects models and tolerance limits for
                 mycotoxin measurements in food-stock lots",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "4:1--4:11",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2586238",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580665/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Badr:2016:TLS,
  author =       "G. Badr and L. J. Klein and M. Freitag and C. M.
                 Albrecht and F. J. Marianno and S. Lu and X. Shao and
                 N. Hinds and G. Hoogenboom and H. F. Hamann",
  title =        "Toward large-scale crop production forecasts for
                 global food security",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "5:1--5:11",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2591698",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580661/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fleming:2016:TFD,
  author =       "K. Fleming and A. Kouassi and E. Ondula and P.
                 Waweru",
  title =        "Toward farmer decision profiles to improve food
                 security in {Kenya}",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "6:1--6:10",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2592278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580717/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eck:2016:TDW,
  author =       "B. J. Eck and H. Saito and S. A. McKenna",
  title =        "Temperature dynamics and water quality in distribution
                 systems",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "7:1--7:8",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2594128",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580677/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bergholz:2016:TAB,
  author =       "P. W. Bergholz and M. Wiedmann",
  title =        "Toward agent-based models for pre-harvest food
                 safety",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "8:1--8:13",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2596378",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580678/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Yam:2016:SPT,
  author =       "K. L. Yam and P. Takhistov",
  title =        "Sustainable packaging technology to improve food
                 safety",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "9:1--9:7",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2597018",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580697/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Li:2016:FTF,
  author =       "H. Li and B. Zhang and L. Zhang and Y. Xue and M. He
                 and C. Ren",
  title =        "A food traceability framework for dairy and other
                 low-margin products",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "10:1--10:8",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2598610",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580662/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vlachos:2016:TIP,
  author =       "M. Vlachos and V. G. Vassiliadis and R. Heckel and A.
                 Labbi",
  title =        "Toward interpretable predictive models in {B2B}
                 recommender systems",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "11:1--11:12",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2602097",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7580713/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2016:Cc,
  author =       "Anonymous",
  title =        "Cover 1",
  journal =      j-IBM-JRD,
  volume =       "60",
  number =       "5--6",
  pages =        "??--??",
  month =        sep # "\slash " # nov,
  year =         "2016",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 4 07:05:32 MDT 2016",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bivens:2017:PCC,
  author =       "Alan Bivens and Hari Ramasamy",
  title =        "Preface: Cognitive and Contextual Analytics for {IT}
                 Services",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "0:1--0:4",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:FCa,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "1--2",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Herger:2017:EES,
  author =       "L. M. Herger and W. J. Rippon and C. A. Fonseca and W.
                 Pointer and B. M. Belgodere and W. H. Cornejo and M. J.
                 Frissora",
  title =        "End-to-end service data analysis: Efficiencies
                 achieved across the enterprise",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "1:5--1:16",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2626858",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877285/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ramakrishna:2017:PEE,
  author =       "V. Ramakrishna and N. Rajput and S. Mukherjea and K.
                 Dey",
  title =        "A platform for end-to-end mobile application
                 infrastructure analytics using system log correlation",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "2:17--2:26",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2626862",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877288/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Deng:2017:ASS,
  author =       "Y. Deng and K. E. Maghraoui and T. D. Griffin and V.
                 Agarwal and S. G. Tamilselvam and R. D. Sharnagat and
                 T. H. Alexander and N. E. G{\'o}mez and C. M. Cramer
                 and A. Bivens and D. Jadav and Z. M. Valli-Hasham and
                 K. Wahlmeier",
  title =        "Advanced search system for {IT} support services",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "3:27--3:40",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2628658",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877289/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Agarwal:2017:APE,
  author =       "S. Agarwal and V. Aggarwal and A. R. Akula and G. B.
                 Dasgupta and G. Sridhara",
  title =        "Automatic problem extraction and analysis from
                 unstructured text in {IT} tickets",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "4:41--4:52",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2629318",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877279/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ponnalagu:2017:ODR,
  author =       "K. Ponnalagu",
  title =        "Ontology-driven root-cause analytics for user-reported
                 symptoms in managed {IT} systems",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "5:53--5:61",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2629319",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877282/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Meng:2017:ITD,
  author =       "F. J. Meng and M. N. Wegman and J. M. Xu and X. Zhang
                 and P. Chen and G. Chafle",
  title =        "{IT} troubleshooting with drift analysis in the
                 {DevOps} era",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "6:62--6:73",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2630478",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877287/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dhoolia:2017:CSB,
  author =       "P. Dhoolia and P. Chugh and P. Costa and N. Gantayat
                 and M. Gupta and N. Kambhatla and R. Kumar and S. Mani
                 and P. Mitra and C. Rogerson and M. Saxena",
  title =        "A cognitive system for business and technical support:
                 A case study",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "7:74--7:85",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2631398",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877283/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sarkar:2017:EST,
  author =       "S. Sarkar and B. Tak",
  title =        "Entity search techniques for expediting entitlement
                 resolution in technology support services",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "8:86--8:97",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2631399",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877284/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Giurgiu:2017:AIP,
  author =       "I. Giurgiu and D. Wiesmann and J. Bogojeska and D.
                 Lanyi and G. Stark and R. B. Wallace and M. M. Pereira
                 and A. A. Hidalgo",
  title =        "On the adoption and impact of predictive analytics for
                 server incident reduction",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "9:98--9:109",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2631400",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877290/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Butler:2017:ESS,
  author =       "E. Butler and T. D. Griffin and D. Jadav and H. P.
                 Petersen and A. A. Barabas",
  title =        "Enterprise storage software lifecycle management
                 system",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "10:110--10:120",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2016.2636758",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877286/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wang:2017:PMB,
  author =       "J. Wang and C. Li and S. Han and S. Sarkar and X.
                 Zhou",
  title =        "Predictive maintenance based on event-log analysis: A
                 case study",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "1",
  pages =        "11:121--11:132",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2648298",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Mar 16 07:01:59 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7877280/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:FCb,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "??--??",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "1--2",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cecchi:2017:PCN,
  author =       "Guillermo A. Cecchi and James Kozloski",
  title =        "Preface: Computational neuroscience",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "0:1--0:4",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cecchi:2017:CSL,
  author =       "G. A. Cecchi and V. Gurev and S. J. Heisig and R.
                 Norel and I. Rish and S. R. Schrecke",
  title =        "Computing the structure of language for
                 neuropsychiatric evaluation",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "1:1--1:10",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921633/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webster:2017:PCS,
  author =       "E. Webster and N. Sukaviriya and H. -Y. Chang and J.
                 Kozloski",
  title =        "Predicting cognitive states from wearable recordings
                 of autonomic function",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "2:1--2:11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921701/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Rish:2017:HBD,
  author =       "I. Rish and G. A. Cecchi",
  title =        "Holographic brain: Distributed versus local activation
                 patterns in {fMRI}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "3:1--3:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921647/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Polosecki:2017:CPA,
  author =       "P. Polosecki and E. Castro and A. Wood and J. H.
                 Warner and I. Rish and G. A. Cecchi",
  title =        "Computational psychiatry: Advancing predictive
                 modeling of neurodegeneration with neuroimaging of
                 {Huntington}'s disease",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "4:1--4:10",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921645/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Lungu:2017:PVM,
  author =       "I. -A. Lungu and A. Riehle and M. P. Nawrot and M.
                 Schmuker",
  title =        "Predicting voluntary movements from motor cortical
                 activity with neuromorphic hardware",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "5:1--5:12",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921644/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dura-Bernal:2017:EAO,
  author =       "S. Dura-Bernal and S. A. Neymotin and C. C. Kerr and
                 S. Sivagnanam and A. Majumdar and J. T. Francis and W.
                 W. Lytton",
  title =        "Evolutionary algorithm optimization of biological
                 learning parameters in a biomimetic neuroprosthesis",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "6:1--6:14",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7922468/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mashford:2017:NNB,
  author =       "B. S. Mashford and A. Jimeno Yepes and I. Kiral-Kornek
                 and J. Tang and S. Harrer",
  title =        "Neural-network-based analysis of {EEG} data using the
                 neuromorphic {TrueNorth} chip for brain-machine
                 interfaces",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "7:1--7:6",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921702/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nieters:2017:NCM,
  author =       "P. Nieters and J. Leugering and G. Pipa",
  title =        "Neuromorphic computation in multi-delay coupled
                 models",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "8:7--8:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921635/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Llobet:2017:MNS,
  author =       "J. -Y. Puigb{\`o} Llobet and M. A. Gonzalez-Ballester
                 and P. F. M. J. Verschure",
  title =        "Modeling the neural substrates of learning through
                 conditioning: A two-phased model",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "9:1--9:11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7922648/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Guo:2017:IAC,
  author =       "J. Guo and C. Shi and G. Azzopardi and N. Petkov",
  title =        "Inhibition-augmented {COSFIRE} model of
                 shape-selective neurons",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "10:1--10:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921700/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Trong:2017:DSM,
  author =       "T. M. Hoang Trong and S. E. Motley and J. Wagner and
                 R. R. Kerr and J. Kozloski",
  title =        "Dendritic spines modify action potential
                 back-propagation in a multicompartment neuronal model",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "2--3",
  pages =        "11:1--11:13",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:15 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/7921703/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:FCc,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "??--??",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2017:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "1--2",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Campbell:2017:PDL,
  author =       "Murray Campbell and Tim Klinger",
  title =        "Preface: Deep learning",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "4:1--4:5",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Saon:2017:RAC,
  author =       "G. Saon and M. Picheny",
  title =        "Recent advances in conversational speech recognition
                 using convolutional and recurrent neural networks",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "1:1--1:10",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030294/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Audhkhasi:2017:RPD,
  author =       "K. Audhkhasi and A. Rosenberg and G. Saon and A. Sethy
                 and B. Ramabhadran and S. Chen and M. Picheny",
  title =        "Recent progress in deep end-to-end models for spoken
                 language processing",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "2:1--2:10",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030300/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Adi:2017:ASE,
  author =       "Y. Adi and E. Kermany and Y. Belinkov and O. Lavi and
                 Y. Goldberg",
  title =        "Analysis of sentence embedding models using prediction
                 tasks in natural language processing",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "3:1--3:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030297/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bhattacharjee:2017:DLD,
  author =       "B. Bhattacharjee and M. L. Hill and H. Wu and P. S.
                 Chandakkar and J. R. Smith and M. N. Wegman",
  title =        "Distributed learning of deep feature embeddings for
                 visual recognition tasks",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "4:1--4:8",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030315/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Codella:2017:DLE,
  author =       "N. C. F. Codella and Q. -B. Nguyen and S. Pankanti and
                 D. A. Gutman and B. Helba and A. C. Halpern and J. R.
                 Smith",
  title =        "Deep learning ensembles for melanoma recognition in
                 dermoscopy images",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "5:1--5:15",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030303/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bozorgtabar:2017:SLS,
  author =       "B. Bozorgtabar and S. Sedai and P. K. Roy and R.
                 Garnavi",
  title =        "Skin lesion segmentation using deep convolution
                 networks guided by local unsupervised learning",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "6:1--6:8",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030296/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nair:2017:WAS,
  author =       "R. Nair and S. Gupta",
  title =        "Wildfire: Approximate synchronization of parameters in
                 distributed deep learning",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "7:1--7:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030302/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gschwind:2017:OED,
  author =       "M. Gschwind and T. Kaldewey and D. K. Tam",
  title =        "Optimizing the efficiency of deep learning through
                 accelerator virtualization",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "12:1--12:11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030299/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Osogami:2017:LVH,
  author =       "T. Osogami and S. Dasgupta",
  title =        "Learning the values of the hyperparameters of a
                 dynamic {Boltzmann} machine",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "8:1--8:8",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030295/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Diaz:2017:EAH,
  author =       "G. I. Diaz and A. Fokoue-Nkoutche and G. Nannicini and
                 H. Samulowitz",
  title =        "An effective algorithm for hyperparameter optimization
                 of neural networks",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "9:1--9:11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030298/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bhattacharjee:2017:IDL,
  author =       "B. Bhattacharjee and S. Boag and C. Doshi and P. Dube
                 and B. Herta and V. Ishakian and K. R. Jayaram and R.
                 Khalaf and A. Krishna and Y. B. Li and V. Muthusamy and
                 R. Puri and Y. Ren and F. Rosenberg and S. R. Seelam
                 and Y. Wang and J. M. Zhang and L. Zhang",
  title =        "{IBM Deep Learning Service}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "10:1--10:11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030274/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Narayanan:2017:TCA,
  author =       "P. Narayanan and A. Fumarola and L. L. Sanches and K.
                 Hosokawa and S. C. Lewis and R. M. Shelby and G. W.
                 Burr",
  title =        "Toward on-chip acceleration of the backpropagation
                 algorithm using nonvolatile memory",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "1--11",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030206/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Ziegler:2017:MLT,
  author =       "M. M. Ziegler and R. Bertran and A. Buyuktosunoglu and
                 P. Bose",
  title =        "Machine learning techniques for taming the complexity
                 of modern hardware design",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "13:1--13:14",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8032559/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bakis:2017:PNL,
  author =       "R. Bakis and D. P. Connors and P. Dube and P.
                 Kapanipathi and A. Kumar and D. Malioutov and C.
                 Venkatramani",
  title =        "Performance of natural language classifiers in a
                 question-answering system",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "14:1--14:10",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030301/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baughman:2017:ULM,
  author =       "A. K. Baughman and S. Hammer and D. Provan",
  title =        "Using language models for improving speech recognition
                 for {U.S. Open Tennis Championships}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "4--5",
  pages =        "15:1--15:9",
  month =        "????",
  year =         "2017",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Sat Sep 16 09:55:16 MDT 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8030314/",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tao:2017:EPD,
  author =       "Y. Tao and D. Bhattacharjya and A. R. Heching and A.
                 Vempaty and M. Singh and F. Lam and J. Houdek and M.
                 Abubakar and A. Abdulwahab and T. Braimoh and N.
                 Ihebuzor and A. Mojsilovi and K. R. Varshney",
  title =        "Effectiveness of peer detailing in a diarrhea program
                 in {Nigeria}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "1:1--1:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2713278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Africa; Diseases; Logistics; Medical services; Medical
                 treatment; Pediatrics; Public healthcare; Regression
                 analysis; Salts; Testing; Zinc",
}

@Article{Chen:2017:EIA,
  author =       "L. L. Chen and J. Xu and Q. Zhang and Q. H. Wang and
                 Y. Q. Xue and C. R. Ren",
  title =        "Evaluating impact of air pollution on different
                 diseases in {Shenzhen, China}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "2:1--2:9",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2713258",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Air pollution; Atmospheric modeling; Diseases; Human
                 factors; Public healthcare; Social factors",
}

@Article{Fang:2017:PPW,
  author =       "F. Fang and T. H. Nguyen and A. Sinha and S. Gholami
                 and A. Plumptre and L. Joppa and M. Tambe and M.
                 Driciru and F. Wanyama and A. Rwetsiba and R. Critchlow
                 and C. M. Beale",
  title =        "Predicting poaching for wildlife protection",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "3:1--3:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2713584",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Algorithm design and analysis; Animals; Computational
                 modeling; Data analysis; Data collection; Data models;
                 Game theory; Hazards; Modeling; Predictive models",
}

@Article{Yadav:2017:USN,
  author =       "A. Yadav and H. Chan and A. X. Jiang and H. Xu and E.
                 Rice and R. Petering and M. Tambe",
  title =        "Using social networks to raise {HIV} awareness among
                 homeless youth",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "4:1--4:10",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2716678",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Computational modeling; Human
                 factors; Human immunodeficiency virus; information
                 services; Knowledge engineering; Social factors; Social
                 network services",
}

@Article{Goudey:2017:FOH,
  author =       "B. Goudey and R. I. Hickson and C. K. H.
                 Hettiarachchige and M. Pore and C. Reeves and O. J.
                 Smith and A. Swan",
  title =        "A framework for optimal health worker allocation in
                 under-resourced regions",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "5:1--5:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2716679",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Data collection; Data models; Decision support
                 systems; Economics; Employment; Medical services;
                 Modeling; Performance evaluation; Resource management;
                 Statistical analysis",
}

@Article{Lamba:2017:UEP,
  author =       "H. Lamba and M. E. Helander and M. Singh and N. Lethif
                 and A. Bhamidipaty and S. A. Baset and A. Mojsilovi and
                 K. R. Varshney",
  title =        "Understanding the ecospace of philanthropic projects",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "6:1--6:10",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2717098",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Databases; Economics; Globalization; Knowledge
                 transfer; Medical services; Organizations; Portfolios;
                 Project management",
}

@Article{Pham:2017:RTU,
  author =       "K. T. Pham and P. Sattigeri and A. Dhurandhar and A.
                 C. Jacob and M. Vukovic and P. Chataigner and J. Freire
                 and A. Mojsilovi and K. R. Varshney",
  title =        "Real-time understanding of humanitarian crises via
                 targeted information retrieval",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "7:1--7:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2722799",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Algorithm design and analysis; Automation;
                 Classification algorithms; Content management;
                 Economics; Feedback; Humanitarian activities;
                 Information retrieval; Organizations; Project
                 management",
}

@Article{Sherchan:2017:HTI,
  author =       "W. Sherchan and S. Pervin and C. J. Butler and J. C.
                 Lai and L. Ghahremanlou and B. Han",
  title =        "Harnessing {Twitter} and {Instagram} for disaster
                 management",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "8:1--8:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2729238",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Australia; Data collection; Disasters; Emergency
                 services; Government; Information technology; Media
                 streaming; Resource management; Social network
                 services",
}

@Article{Patterson:2017:DRD,
  author =       "E. Patterson and R. McBurney and H. Schmidt and I.
                 Baldini and A. Mojsilovi and K. R. Varshney",
  title =        "Dataflow representation of data analyses: Toward a
                 platform for collaborative data science",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "9:1--9:13",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2736278",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Biological system modeling; Collaboration; Data
                 science; Graphical models; Medical services; Medical
                 treatment; Multiple sclerosis; Patient rehabilitation",
}

@Article{Bolten:2017:PCD,
  author =       "N. Bolten and S. Mukherjee and V. Sipeeva and A.
                 Tanweer and A. Caspi",
  title =        "A pedestrian-centered data approach for equitable
                 access to urban infrastructure environments",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "10:1--10:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2736279",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Assistive technology; Data models; Information
                 technology; Public policy; Routing; Transient analysis;
                 Urban areas",
}

@Article{Kuhlman:2017:HFI,
  author =       "C. Kuhlman and K. N. Ramamurthy and P. Sattigeri and
                 A. C. Lozano and L. Cao and C. Reddy and A. Mojsilovi
                 and K. R. Varshney",
  title =        "How to foster innovation: A data-driven approach to
                 measuring economic competitiveness",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "11:1--11:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2741820",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Economics; Globalization; Government policies; Machine
                 learning; Measurement; Modeling; Predictive models;
                 Technological innovation",
}

@Article{Zeni:2017:EIN,
  author =       "M. Zeni and K. Weldemariam",
  title =        "Extracting information from newspaper archives in
                 {Africa}",
  journal =      j-IBM-JRD,
  volume =       "61",
  number =       "6",
  pages =        "12:1--12:12",
  month =        nov,
  year =         "2017",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2017.2742706",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Dec 7 06:17:20 2017",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Africa; Data mining; Electronic publishing;
                 Information retrieval; Public policy; Publishing; Text
                 mining",
}

@Article{Anonymous:2018:FCa,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "??--??",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chen:2018:PUG,
  author =       "Ching-Hua Chen and Kenney Ng",
  title =        "Preface: User-generated health data and applications",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "1--3",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bocu:2018:HEB,
  author =       "R. Bocu and C. Costache",
  title =        "A homomorphic encryption-based system for securely
                 managing personal health metrics data",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "1:1--1:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269765/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kakkanatt:2018:CIU,
  author =       "C. Kakkanatt and M. Benigno and V. M. Jackson and P.
                 L. Huang and K. Ng",
  title =        "Curating and integrating user-generated health data
                 from multiple sources to support healthcare analytics",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "2:1--2:7",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269772/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Codella:2018:DQC,
  author =       "J. Codella and C. Partovian and H. -Y. Chang and C.
                 -H. Chen",
  title =        "Data quality challenges for person-generated health
                 and wellness data",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "3:1--3:8",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269766/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hu:2018:IHB,
  author =       "X. Hu and P. -Y. S. Hsueh and C. -H. Chen and K. M.
                 Diaz and F. E. Parsons and I. Ensari and M. Qian and Y.
                 -K. K. Cheung",
  title =        "An interpretable health behavioral intervention policy
                 for mobile device users",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "4:1--4:6",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269770/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pissadaki:2018:DCM,
  author =       "E. K. Pissadaki and A. G. S. Abrami and S. J. Heisig
                 and E. Bilal and M. Cavallo and P. W. Wacnik and K. Erb
                 and D. R. Karlin and P. R. Bergethon and S. P. Amato
                 and H. Zhang and V. L. Ramos and F. Hameed and J. J.
                 Rice",
  title =        "Decomposition of complex movements into primitives for
                 {Parkinson}'s disease assessment",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "5:1--5:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269771/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Takagi:2018:ESB,
  author =       "H. Takagi and M. Ohno and M. Kobayashi and T. Nakada",
  title =        "Evaluating speech-based question--answer interactions
                 for elder-care services",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "6:1--6:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269769/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Vioules:2018:DSR,
  author =       "M. Johnson Vioul{\`e}s and B. Moulahi and J. Az{\'e}
                 and S. Bringay",
  title =        "Detection of suicide-related posts in {Twitter} data
                 streams",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "7:1--7:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269767/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kloeckner:2018:BCP,
  author =       "K. Kloeckner and C. M. Adam and N. Anerousis and N.
                 Ayachitula and M. F. Bulut and G. Dasgupta and Y. Deng
                 and Y. Diao and N. Fuller and S. Gopisetty and M.
                 Hernandez and J. Hwang and P. Iannucci and A. K. Kalia
                 and G. Lanfranchi and D. Lanyi and H. Ludwig and A.
                 Mahamuni and R. Mahindru and F. J. Meng and H. R.
                 Motahari Nezhad and K. Murthy and T. Nakamura and A.
                 Paradkar and D. Perpetua and B. Pfitzmann and D. Rosu
                 and L. Shwartz and Z. Su and M. Surendra and S. Tao and
                 H. V{\"o}lzer and M. Vukovic and D. Wiesmann and S.
                 Wozniak and G. Wright and J. Xiao and S. Zeng",
  title =        "Building a cognitive platform for the managed {IT}
                 services lifecycle",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "8:1--8:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269344/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Gschwind:2018:RSE,
  author =       "M. Gschwind and U. Weigand",
  title =        "Reengineering a server ecosystem for enhanced
                 portability and performance",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "1",
  pages =        "9:1--9:13",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 1 06:34:25 MST 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "http://ieeexplore.ieee.org/document/8269768/",
  acknowledgement = ack-nhfb,
  journal-URL =  "ahttp://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:FCb,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "??--??",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mauri:2018:MGM,
  author =       "R. A. Mauri",
  title =        "Message from the {General Manager, IBM Z}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8353753/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eickhoff:2018:PIZ,
  author =       "Felix Eickhoff",
  title =        "Preface: {IBM z14} Design and Technology",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "1--4",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8353758/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eickhoff:2018:LSA,
  author =       "F. L. Eickhoff and M. L. McGrath and C. Mayer and A.
                 Bieswanger and P. A. Wojciak",
  title =        "Large-scale application of {IBM} Design Thinking and
                 Agile development for {IBM z14}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "1:1--1:9",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8270603/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jordan:2018:EPE,
  author =       "M. Jordan and N. Sardino and M. McGrath and C. Zoellin
                 and T. E. Morris and C. Carranza Lewis and G. Vance and
                 B. Naylor and J. Pickel and M. S. Almeida and D.
                 Wierbowski and C. Meyer and R. Buendgen and M. Zagorski
                 and H. Schoone and K. Voss",
  title =        "Enabling pervasive encryption through {IBM Z} stack
                 innovations",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "2:1--2:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8270590/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roscher:2018:ISI,
  author =       "S. Roscher and V. B{\"o}nisch and J. Lee and D.
                 Zeisberg and J. Schweflinghaus",
  title =        "Integrating solutions on {IBM Z} with {Secure Service
                 Container}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "3:1--3:6",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8281496/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mencias:2018:OBS,
  author =       "A. Nu{\~n}ez Mencias and D. Dillenberger and P.
                 Novotny and F. Toth and T. E. Morris and V. Paprotski
                 and J. Dayka and T. Visegrady and B. O'Farrell and J.
                 Lang and E. Carbarnes",
  title =        "An optimized blockchain solution for the {IBM z14}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "4:1--4:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8276264/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bradbury:2018:IZC,
  author =       "J. D. Bradbury and A. Chatterjee and A. Saporito and
                 N. P. Sardino and J. S. Siu and A. T. Sofia and E.
                 Tzortzatos and K. W. Wei",
  title =        "{IBM z14} and the Cognitive Era",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "5:1--5:9",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8268108/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mayer:2018:PSI,
  author =       "C. Mayer and A. Brand and A. Bieswanger and B. D.
                 Valentine and E. A. Weinmann and H. Wolf and T. Reiser
                 and S. Korba and W. Niklaus",
  title =        "Platform simplification for {IBM z14}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "6:1--6:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8268109/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Walters:2018:PII,
  author =       "C. R. Walters and D. S. Hutton and E. W. Chencinski
                 and C. Axnix and R. Winkelmann and M. Fee and A.
                 Saporito and C. Jacobi",
  title =        "Performance innovations in the {IBM z14} platform",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "7:1--7:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8269266/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jacobi:2018:DIZ,
  author =       "C. Jacobi and A. Saporito and M. Recktenwald and A.
                 Tsai and U. Mayer and M. Helms and A. B. Collura and P.
                 -K. Mak and R. J. Sonnelitter and M. A. Blake and T. C.
                 Bronson and A. J. O'Neill and V. K. Papazova",
  title =        "Design of the {IBM z14} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "8:1--8:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8270679/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berry:2018:IZD,
  author =       "C. Berry and J. Warnock and J. Badar and D. G. Bair
                 and E. Behnen and B. Bell and A. Buyuktosunoglu and C.
                 Cavitt and P. Chuang and O. Geva and D. Hamid and J.
                 Isakson and P. M. Lobo and F. Malgioglio and G. Mayer
                 and J. L. Neves and T. Strach and J. Surprise and C.
                 Vezyrtzis and T. Webel and D. Wolpert",
  title =        "{IBM z14} design methodology enhancements in the 14-nm
                 technology node",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "9:1--9:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8276267/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wolpert:2018:IZE,
  author =       "D. Wolpert and E. Behnen and L. Sigal and Y. Chan and
                 G. E. T{\'e}llez and D. Bradley and R. Serton and R.
                 Veerabhadraiah and W. Ansley and A. Bianchi and N.
                 Dhanwada and S. Lee and M. Scheuermann and G.
                 Wiedemeier and J. Davis and T. Werner and L. Darden and
                 K. Barkley and M. Gray and M. Guzowski and M. DeHond
                 and T. Schell and S. Tsapepas and D. Phan and K.
                 Acharya and J. A. Zitz and H. F. Shi and C. Berry and
                 J. Warnock and M. H. Wood and R. M. Averill III",
  title =        "{IBM z14}: Enabling physical design in 14-nm
                 technology for high-performance, high-reliability
                 microprocessors",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "10:1--10:14",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8276273/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stiffler:2018:PTI,
  author =       "S. R. Stiffler and R. Ramachandran and W. K. Henson
                 and N. D. Zamdmer and K. McStay and G. {La Rosa} and K.
                 M. Boyd and S. Lee and C. Ortolland and P. C. Parries",
  title =        "Process technology for {IBM} 14-nm processor designs
                 featuring silicon-on-insulator {FinFETs}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "11:1--11:7",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8276292/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Zoellin:2018:NDC,
  author =       "C. G. Zoellin and O. Draese and J. D. Bradbury and C.
                 Jacobi and A. Puranik and P. Sutton and R. Tokumaru",
  title =        "New database compression assists in the {IBM z14}
                 processor",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "12:1--12:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8281056/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Craddock:2018:ZLL,
  author =       "D. Craddock and A. Hoshikawa and J. Josten and D. F.
                 Riedy and P. G. Sutton and H. M. Yudenfriend",
  title =        "{zHyperLink}: Low-latency {I/O} for {Db2} on {IBM Z}
                 and {DS8880} storage",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "13:1--13:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8280518/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Becht:2018:IZA,
  author =       "M. Becht and S. G. Aden and T. Bubb and C. Colonna and
                 R. Higgs and L. Hopkins and A. Li and M. Saleheen and
                 J. F. Silverio and R. Wong and M. Zee",
  title =        "{IBM z14}: Advancing the {I/O} storage and networking
                 channel adapter",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "14:1--14:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8281488/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Surman:2018:IZP,
  author =       "D. H. Surman and G. L. Kurdt and R. K. Errickson and
                 P. D. Driever and A. M. Clayton and S. N. Goss and P.
                 K. Szwed",
  title =        "{IBM z14 Parallel Sysplex} and coupling technology",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "15:1--15:8",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8281498/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kostenko:2018:IZI,
  author =       "W. P. Kostenko and D. W. Demetriou and J. G. Torok",
  title =        "{IBM z14}: Improved datacenter characteristics, energy
                 efficiency, and packaging innovation",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "2--3",
  pages =        "16:1--16:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu May 10 14:55:17 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8283825/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:FCc,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "??--??",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Picciano:2018:MSV,
  author =       "Bob Picciano",
  title =        "Message from the {Senior Vice President, IBM Cognitive
                 Systems}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8464027/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pattnaik:2018:PIP,
  author =       "Pratap Pattnaik",
  title =        "Preface: {IBM POWER9} Technology",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "1--2",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8463988/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Arimilli:2018:IPP,
  author =       "L. B. Arimilli and B. Blaner and B. C. Drerup and C.
                 F. Marino and D. E. Williams and E. N. Lais and F. A.
                 Campisano and G. L. Guthrie and M. S. Floyd and R. B.
                 Leavens and S. M. Willenborg and R. Kalla and B.
                 Abali",
  title =        "{IBM POWER9} processor and system features for
                 computing in the cognitive era",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "1:1--1:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8458465/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Le:2018:IPP,
  author =       "H. Q. Le and J. A. {Van Norstrand} and B. W. Thompto
                 and J. E. Moreira and D. Q. Nguyen and D. Hrusecky and
                 M. J. Genden and M. Kroener",
  title =        "{IBM POWER9} processor core",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "2:1--2:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8409955/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Starke:2018:IPM,
  author =       "W. J. Starke and J. S. Dodson and J. Stuecheli and E.
                 Retter and B. W. Michael and S. J. Powell and J. A.
                 Marcella",
  title =        "{IBM POWER9} memory architectures for optimized
                 systems",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "3:1--3:13",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8383687/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Fluhr:2018:IPC,
  author =       "E. J. Fluhr and R. M. Rao and H. Smith and A.
                 Buyuktosunoglu and R. Bertran",
  title =        "{IBM POWER9} circuit design and energy optimization
                 for $ 14$-nm technology",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "4:1--4:11",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8383685/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Auernhammer:2018:XEI,
  author =       "F. Auernhammer and R. L. Arndt",
  title =        "{XIVE}: External interrupt virtualization for the
                 cloud infrastructure",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "5:1--5:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
  URL =          "https://ieeexplore.ieee.org/document/8383690/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Jann:2018:IPS,
  author =       "J. Jann and P. Mackerras and J. Ludden and M. Gschwind
                 and W. Ouren and S. Jacobs and B. F. Veale and D.
                 Edelsohn",
  title =        "{IBM POWER9} system software",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "6:1--6:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8392671/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nett:2018:IPS,
  author =       "N. S. Nett and R. X. Arroyo and T. Nguyen and B. W.
                 Mashak and R. M. Zgabay and H. Nguyen and C. W. Mann
                 and E. J. Hauptli and S. P. Mroz and W. J. Anderl",
  title =        "{IBM POWER9} systems designed for commercial,
                 cognitive, and cloud",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "7:1--7:13",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8458311/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stuecheli:2018:IPO,
  author =       "J. Stuecheli and W. J. Starke and J. D. Irish and L.
                 B. Arimilli and D. Dreps and B. Blaner and C. Wollbrink
                 and B. Allison",
  title =        "{IBM POWER9} opens up a new era of acceleration
                 enablement: {OpenCAPI}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "8:1--8:8",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8413085/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kumar:2018:IPC,
  author =       "M. Kumar and W. P. Horn and J. Kepner and J. E.
                 Moreira and P. Pattnaik",
  title =        "{IBM POWER9} and cognitive computing",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "10:1--10:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8392693/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Schubert:2018:AVC,
  author =       "K. -D. Schubert and S. S. Abrar and D. Averill and E.
                 Bauman and A. C. Brown and R. Cash and D. Chatterjee
                 and J. Gullickson and M. Nelson and K. A. Pasnik and K.
                 Sugavanam",
  title =        "Addressing verification challenges of heterogeneous
                 systems based on {IBM POWER9}",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "11:1--11:12",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8387435/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Chun:2018:IPP,
  author =       "S. Chun and W. D. Becker and J. Casey and S. Ostrander
                 and D. Dreps and J. A. Hejase and R. M. Nett and B.
                 Beaman and J. R. Eagle",
  title =        "{IBM POWER9} package technology and design",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "4--5",
  pages =        "12:1--12:10",
  month =        "????",
  year =         "2018",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Sep 13 11:17:13 MDT 2018",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  URL =          "https://ieeexplore.ieee.org/document/8392682/",
  acknowledgement = ack-nhfb,
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:FCd,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "C1--C1",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2895986",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 11 10:51:01 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2018:TCd,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "1--2",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2895984",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:52:41 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cornell:2018:PCT,
  author =       "W. Cornell",
  title =        "Preface: Computational Technologies for Drug
                 Discovery",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "1--2",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893982",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:52:41 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cooper:2018:CNC,
  author =       "K. Cooper",
  title =        "The challenge of new chemical entities attrition",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "1:1--1:9",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2883313",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:52:41 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Biology; Companies; Compounds; Diseases; Drugs;
                 Testing",
}

@Article{Pyzer-Knapp:2018:BOA,
  author =       "E. O. Pyzer-Knapp",
  title =        "{Bayesian} optimization for accelerated drug
                 discovery",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "2:1--2:7",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2881731",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:52:41 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bayes methods; Compounds; Diseases; Drugs;
                 Optimization; Predictive models; Task analysis",
}

@Article{Koes:2018:PBC,
  author =       "D. R. Koes",
  title =        "The {Pharmit} backend: A computer systems approach to
                 enabling interactive online drug discovery",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "3:1--3:6",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2883977",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:52:41 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Compounds; Data structures; Databases; Libraries;
                 Metadata; Parallel processing; Shape",
}

@Article{Acun:2018:SMD,
  author =       "B. Acun and D. J. Hardy and L. V. Kale and K. Li and
                 J. C. Phillips and J. E. Stone",
  title =        "Scalable molecular dynamics with {NAMD} on the
                 {Summit} system",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "4:1--4:9",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2888986",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Biological system modeling; Computational modeling;
                 Computer architecture; Force; Graphics processing
                 units; Layout",
}

@Article{Zipoli:2018:SMD,
  author =       "F. Zipoli and M. Hijazi and R. Petraglia and V. Weber
                 and T. Laino",
  title =        "Semiempirical molecular dynamics ({SEMD}) simulations:
                 Parameterization and validation for biological systems
                 precursors",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "5:1--5:9",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2887388",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Biological system modeling; Computational efficiency;
                 Computational modeling; Manganese; Mathematical model;
                 Orbits; Reliability",
}

@Article{Cao:2018:PQC,
  author =       "Y. Cao and J. Romero and A. Aspuru-Guzik",
  title =        "Potential of quantum computing for drug discovery",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "6:1--6:20",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2888987",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Computational modeling; Computers; Drugs; Machine
                 learning; Proteins; Quantum computing",
}

@Article{Shim:2018:SAD,
  author =       "J. Shim and H. Luo and P. Zhang and Y. Li",
  title =        "Systematic analysis of drug combinations that mitigate
                 adverse drug reactions",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "7:1--7:9",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2875837",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Antidepressants; Biological information theory;
                 Chemicals; Diseases; Prediction algorithms;
                 Systematics",
}

@Article{Martin:2018:HNL,
  author =       "R. L. Martin and D. Martinez Iraola and E. Louie and
                 D. Pierce and B. A. Tagtow and J. J. Labrie and P. G.
                 Abrahamson",
  title =        "Hybrid natural language processing for
                 high-performance patent and literature mining in {IBM
                 Watson} for Drug Discovery",
  journal =      j-IBM-JRD,
  volume =       "62",
  number =       "6",
  pages =        "8:1--8:12",
  month =        nov # "\slash " # dec,
  year =         "2018",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2888975",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Chemicals; Compounds; Data mining; Dictionaries;
                 Drugs; Ontologies; Runtime",
}

@Article{Anonymous:2019:FCa,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "C1--C1",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2905502",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "1--2",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2905500",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:PAC,
  author =       "Anonymous",
  title =        "Preface: Advances in Computational Creativity
                 Technology",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "1--2",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2906830",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Wiltgen:2019:CTE,
  author =       "B. J. Wiltgen and A. K. Goel",
  title =        "A computational theory of evaluation in creative
                 design",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "1:1--1:11",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893901",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Biological system modeling;
                 Computational modeling; Creativity; Problem-solving;
                 Rail transportation",
}

@Article{Varshney:2019:MLT,
  author =       "L. R. Varshney",
  title =        "Mathematical limit theorems for computational
                 creativity",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "2:1--2:12",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893907",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bayes methods; Cognition; Computational modeling;
                 Creativity; Information geometry; Information theory;
                 Social groups",
}

@Article{Agrawal:2019:WDC,
  author =       "S. Agrawal and A. Sankaran and A. Laha and S. A.
                 Chemmengath and D. Shrivastava and K.
                 Sankaranarayanan",
  title =        "What is deemed computationally creative?",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "3:1--3:12",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900640",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Art; Artificial intelligence; Coherence; Creativity;
                 Motion pictures; Task analysis; Writing",
}

@Article{Khabiri:2019:CCP,
  author =       "E. Khabiri and Y. Li and P. Mazzoleni and D. Vadgama",
  title =        "Cognitive color palette creation using client message
                 and color psychology",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "4:1--4:10",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893904",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Color; Companies; Computer architecture; Image color
                 analysis; Packaging; Psychology; Visualization",
}

@Article{Karimi:2019:CMV,
  author =       "P. Karimi and M. L. Maher and K. Grace and N. Davis",
  title =        "A computational model for visual conceptual blends",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "5:1--5:10",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2018.2881736",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Cognition; Computational
                 modeling; Creativity; Task analysis; Tools;
                 Visualization",
}

@Article{Ray:2019:CTG,
  author =       "A. Ray and P. Agarwal and C. K. Maurya and G. B.
                 Dasgupta",
  title =        "Creative tagline generation framework for product
                 advertisement",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "6:1--6:10",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893900",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Advertising; Cotton; Creativity; Data mining;
                 Measurement; Task analysis; Tools",
}

@Article{Varshney:2019:BDA,
  author =       "L. R. Varshney and F. Pinel and K. R. Varshney and D.
                 Bhattacharjya and A. Sch{\"o}rgendorfer and Y.-M.
                 Chee",
  title =        "A big data approach to computational creativity: The
                 curious case of {Chef Watson}",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "7:1--7:18",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2893905",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Cats; Computational modeling; Computers; Correlation;
                 Creativity; Prediction algorithms; Systems
                 architecture",
}

@Article{Gervas:2019:LPN,
  author =       "P. Gerv{\'a}s and E. Concepci{\'o}n and C. Le{\'o}n
                 and G. M{\'e}ndez and P. Delatorre",
  title =        "The long path to narrative generation",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "8:1--8:10",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2896157",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Computational modeling; Creativity; Focusing;
                 Generators; Planning; Task analysis; Tools",
}

@Article{Martins:2019:CCI,
  author =       "P. Martins and H. G. Oliveira and J. C.
                 Gon{\c{c}}alves and A. Cruz and F. A. Cardoso and M.
                 {\v{Z}}nidar{\v{s}}i{\v{c}} and N. Lavra{\v{c}} and S.
                 Linkola and H. Toivonen and R. Herv{\'a}s and G.
                 M{\'e}ndez and P. Gerv{\'a}s",
  title =        "Computational creativity infrastructure for online
                 software composition: A conceptual blending use case",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "1",
  pages =        "9:1--9:17",
  month =        jan # "\slash " # feb,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2898417",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Computer architecture; Computer viruses; Creativity;
                 Laboratories; Task analysis; Visualization",
}

@Article{Anonymous:2019:FCb,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "C1--C1",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2912086",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "1--2",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2912084",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Tue Oct 1 09:44:15 2019",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:PBT,
  author =       "Anonymous",
  title =        "Preface: Blockchain: From Technology to Solutions",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "1--2",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2912087",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Blockchain; Computer architecture; Cryptography;
                 Fabrics; History; Smart contracts; Supply chains",
}

@Article{Viswanathan:2019:BSR,
  author =       "R. Viswanathan and D. Dasgupta and S. R.
                 Govindaswamy",
  title =        "{Blockchain Solution Reference Architecture (BSRA)}",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "1:1--1:12",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2913629",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Architecture; Blockchain; Distributed databases;
                 Distributed ledger; Security; Stakeholders",
}

@Article{Manevich:2019:EHF,
  author =       "Y. Manevich and A. Barger and Y. Tock",
  title =        "Endorsement in Hyperledger Fabric via service
                 discovery",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "2:1--2:9",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900647",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bitcoin; Blockchain; Fabrics; Peer-to-peer computing;
                 Smart contracts",
}

@Article{Benhamouda:2019:SPD,
  author =       "F. Benhamouda and S. Halevi and T. Halevi",
  title =        "Supporting private data on {Hyperledger Fabric} with
                 secure multiparty computation",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "3:1--3:8",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2913621",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Blockchain; Computer architecture; Cryptography;
                 Fabrics; Peer-to-peer computing; Smart contracts",
}

@Article{Balagurusamy:2019:CA,
  author =       "V. S. K. Balagurusamy and C. Cabral and S.
                 Coomaraswamy and E. Delamarche and D. N. Dillenberger
                 and G. Dittmann and D. Friedman and O. G{\"o}k{\c{c}}e
                 and N. Hinds and J. Jelitto and A. Kind and A. D. Kumar
                 and F. Libsch and J. W. Ligman and S. Munetoh and C.
                 Narayanaswami and A. Narendra and A. Paidimarri and M.
                 A. P. Delgado and J. Rayfield and C. Subramanian and R.
                 Vaculin",
  title =        "Crypto anchors",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "4:1--4:12",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900651",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2010.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Authentication; Blockchain; Cryptography; Databases;
                 Supply chains",
}

@Article{Dillenberger:2019:BAA,
  author =       "D. N. Dillenberger and P. Novotny and Q. Zhang and P.
                 Jayachandran and H. Gupta and S. Hans and D. Verma and
                 S. Chakraborty and J. J. Thomas and M. M. Walli and R.
                 Vaculin and K. Sarpatwar",
  title =        "Blockchain analytics and artificial intelligence",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "5:1--5:14",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900638",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analytical models; Artificial intelligence;
                 Blockchain; Data models; Databases; Fabrics; History",
}

@Article{Tateishi:2019:ASC,
  author =       "T. Tateishi and S. Yoshihama and N. Sato and S.
                 Saito",
  title =        "Automatic smart contract generation using controlled
                 natural language and template",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "6:1--6:12",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900643",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Law; Marine vehicles; Natural languages; Smart
                 contracts",
}

@Article{Narayanaswami:2019:BAS,
  author =       "C. Narayanaswami and R. Nooyi and S. R. Govindaswamy
                 and R. Viswanathan",
  title =        "Blockchain anchored supply chain automation",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "7:1--7:11",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2900655",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Automation; Blockchain; Complexity theory;
                 Optimization; Real-time systems; Supply chains",
}

@Article{Curbera:2019:BEH,
  author =       "F. Curbera and D. M. Dias and V. Simonyan and W. A.
                 Yoon and A. Casella",
  title =        "Blockchain: An enabler for healthcare and life
                 sciences transformation",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "2--3",
  pages =        "8:1--8:9",
  month =        mar # "\slash " # may,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2913622",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Jul 25 15:06:42 2019",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/bitcoin.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Blockchain; Clinical trials; Smart contracts",
}

@Article{Anonymous:2019:FCc,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "C1--C1",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945749",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:TCc,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "1--2",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945747",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:PAE,
  author =       "Anonymous",
  title =        "Preface: {AI} Ethics",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "1--1",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2944775",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Balakrishnan:2019:UMA,
  author =       "A. Balakrishnan and D. Bouneffouf and N. Mattei and F.
                 Rossi",
  title =        "Using multi-armed bandits to learn ethical priorities
                 for online {AI} systems",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "1:1--1:13",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945271",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Decision making; Education; Ethics; Linear
                 programming; Motion pictures; Reinforcement learning",
}

@Article{Noothigattu:2019:TAA,
  author =       "R. Noothigattu and D. Bouneffouf and N. Mattei and R.
                 Chandra and P. Madan and K. R. Varshney and M. Campbell
                 and M. Singh and F. Rossi",
  title =        "Teaching {AI} agents ethical values using
                 reinforcement learning and policy orchestration",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "2:1--2:9",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2940428",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Decision making; Ethics; Neural networks;
                 Reinforcement learning; Robots; Trajectory",
}

@Article{Sattigeri:2019:FGG,
  author =       "P. Sattigeri and S. C. Hoffman and V. Chenthamarakshan
                 and K. R. Varshney",
  title =        "Fairness {GAN}: Generating datasets with fairness
                 properties using a generative adversarial network",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "3:1--3:9",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945519",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Decision making; Employment; Gallium nitride;
                 Generative adversarial networks; Generators; Sports;
                 Training",
}

@Article{Bellamy:2019:AFE,
  author =       "R. K. E. Bellamy and K. Dey and M. Hind and S. C.
                 Hoffman and S. Houde and K. Kannan and P. Lohia and J.
                 Martino and S. Mehta and A. {Mojsilovi } and S. Nagar
                 and K. N. Ramamurthy and J. Richards and D. Saha and P.
                 Sattigeri and M. Singh and K. R. Varshney and Y.
                 Zhang",
  title =        "{AI Fairness 360}: An extensible toolkit for detecting
                 and mitigating algorithmic bias",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "4:1--4:15",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2942287",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Data models; Machine learning
                 algorithms; Measurement; Open source software;
                 Pipelines; Prediction algorithms",
}

@Article{Srivastava:2019:RAS,
  author =       "B. Srivastava and F. Rossi",
  title =        "Rating {AI} systems for bias to promote trustable
                 applications",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "5:1--5:9",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2935966",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Buildings; Decision making;
                 Distortion; Ethics; Presses; Testing",
}

@Article{Arnold:2019:FIT,
  author =       "M. Arnold and R. K. E. Bellamy and M. Hind and S.
                 Houde and S. Mehta and A. {Mojsilovi } and R. Nair and
                 K. N. Ramamurthy and A. Olteanu and D. Piorkowski and
                 D. Reimer and J. Richards and J. Tsay and K. R.
                 Varshney",
  title =        "{FactSheets}: Increasing trust in {AI} services
                 through supplier's declarations of conformity",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "6:1--6:13",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2942288",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Industries; Safety; Security;
                 Software; Standards; Testing",
}

@Article{Coates:2019:IEM,
  author =       "D. L. Coates and A. Martin",
  title =        "An instrument to evaluate the maturity of bias
                 governance capability in artificial intelligence
                 projects",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "7:1--7:15",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2915062",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Ethics; Instruments;
                 Organizations; Standards organizations",
}

@Article{Rodriguez:2019:BGS,
  author =       "M. Y. Rodriguez and D. DePanfilis and P. Lanier",
  title =        "Bridging the gap: Social work insights for ethical
                 algorithmic decision-making in human services",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "8:1--8:8",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2934047",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Buildings; Context modeling; Decision making;
                 Prediction algorithms; Predictive models; Resilience",
}

@Article{Simbeck:2019:HAE,
  author =       "K. Simbeck",
  title =        "{HR} analytics and ethics",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "4--5",
  pages =        "9:1--9:12",
  month =        jul,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2915067",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Companies; Data privacy; Ethics; Medical diagnostic
                 imaging; Medical services; Privacy; Training",
}

@Article{Anonymous:2019:FCd,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "C1--C1",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2948244",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:Ca,
  author =       "Anonymous",
  title =        "Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "C2--C2",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2948185",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:TCd,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "1--2",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2948242",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2019:PHA,
  author =       "Anonymous",
  title =        "Preface: Hardware for {AI}",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "1--2",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945553",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Cho:2019:BDA,
  author =       "M. Cho and U. Finkler and M. Serrano and D. Kung and
                 H. Hunter",
  title =        "{BlueConnect}: Decomposing all-reduce for deep
                 learning on heterogeneous network hierarchy",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "1:1--1:11",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947013",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bandwidth; Deep learning; Heterogeneous networks;
                 Libraries; Neural networks; Synchronization; Training",
}

@Article{Womble:2019:EES,
  author =       "D. E. Womble and M. Shankar and W. Joubert and J. T.
                 Johnston and J. C. Wells and J. A. Nichols",
  title =        "Early experiences on {Summit}: Data analytics and {AI}
                 applications",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "2:1--2:9",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2944146",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Acceleration; Computational modeling; Data analysis;
                 Data models; Deep learning; Graphics processing units",
}

@Article{Ghose:2019:PMW,
  author =       "S. Ghose and A. Boroumand and J. S. Kim and J.
                 G{\'o}mez-Luna and O. Mutlu",
  title =        "Processing-in-memory: a workload-driven perspective",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "3:1--3:19",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2934048",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Computers; Memory management; Nonvolatile memory;
                 Random access memory; Technological innovation;
                 Through-silicon vias",
}

@Article{Mukhopadhyay:2019:HIA,
  author =       "S. Mukhopadhyay and Y. Long and B. Mudassar and C. S.
                 Nair and B. H. DeProspo and H. M. Torun and M.
                 Kathaperumal and V. Smet and D. Kim and S. Yalamanchili
                 and M. Swaminathan",
  title =        "Heterogeneous integration for artificial intelligence:
                 Challenges and opportunities",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "4:1--4:1",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947373",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Bandwidth; Computer architecture; Copper; Fabrication;
                 Glass; Silicon; Substrates",
}

@Article{Iyer:2019:SIF,
  author =       "S. S. Iyer and S. Jangam and B. Vaisband",
  title =        "Silicon interconnect fabric: a versatile heterogeneous
                 integration platform for {AI} systems",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "5:1--5:16",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2940427",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial intelligence; Bandwidth; Complexity theory;
                 Google; Packaging; Silicon; Wiring",
}

@Article{Amid:2019:CDD,
  author =       "A. Amid and K. Kwon and A. Gholami and B. Wu and K.
                 {Asanovi } and K. Keutzer",
  title =        "Co-design of deep neural nets and neural net
                 accelerators for embedded vision applications",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "6:1--6:14",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2942284",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Artificial neural networks; Benchmark testing;
                 Computational modeling; Computer vision; Hardware;
                 Program processors",
}

@Article{Eleftheriou:2019:DLA,
  author =       "E. Eleftheriou and M. L. Gallo and S. R. Nandakumar
                 and C. Piveteau and I. Boybat and V. Joshi and R.
                 Khaddam-Aljameh and M. Dazzi and I. Giannopoulos and G.
                 Karunaratne and B. Kersting and M. Stanislavjevic and
                 V. P. Jonnalagadda and N. Ioannou and K. Kourtis and P.
                 A. Francese and A. Sebastian",
  title =        "Deep learning acceleration based on in-memory
                 computing",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "7:1--7:16",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947008",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Analog memory; Computer architecture; Deep learning;
                 Neurons; Performance evaluation; Task analysis;
                 Training",
}

@Article{Chang:2019:AHA,
  author =       "H. -. Chang and P. Narayanan and S. C. Lewis and N. C.
                 P. Farinha and K. Hosokawa and C. Mackin and H. Tsai
                 and S. Ambrogio and A. Chen and G. W. Burr",
  title =        "{AI} hardware acceleration with analog memory:
                 Microarchitectures for low energy at high speed",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "8:1--8:14",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2934050",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Arrays; Capacitors; Hardware; Neural networks;
                 Nonvolatile memory; Throughput; Training",
}

@Article{Fuller:2019:RTN,
  author =       "E. J. Fuller and Y. Li and C. Bennet and S. T. Keene
                 and A. Melianas and S. Agarwal and M. J. Marinella and
                 A. Salleo and A. A. Talin",
  title =        "Redox transistors for neuromorphic computing",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "9:1--9:9",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2942285",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Capacitors; Electrodes; Field effect transistors;
                 Logic gates; Memristors; Programming",
}

@Article{Jain:2019:NNA,
  author =       "S. Jain and A. Ankit and I. Chakraborty and T. Gokmen
                 and M. Rasch and W. Haensch and K. Roy and A.
                 Raghunathan",
  title =        "Neural network accelerator design with resistive
                 crossbars: Opportunities and challenges",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "10:1--10:13",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947011",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/virtual-machines.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
  keywords =     "Encoding; Hardware; Performance evaluation;
                 Programming; Task analysis; Training; Virtual machine
                 monitors",
}

@Article{Anonymous:2019:C,
  author =       "Anonymous",
  title =        "Cover",
  journal =      j-IBM-JRD,
  volume =       "63",
  number =       "6",
  pages =        "C4--C4",
  month =        nov,
  year =         "2019",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2948187",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Mon Jan 20 18:12:12 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:FCa,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "C1--C1",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.2970511",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:TCa,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "1--2",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.2973822",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:PDR,
  author =       "Anonymous",
  title =        "Preface: Disaster Response and Management",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "1--3",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.2966837",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Talley:2020:DMD,
  author =       "J. W. Talley",
  title =        "Disaster management in the digital age",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "1:1--1:5",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2954412",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Curzon:2020:UAC,
  author =       "R. E. Curzon and P. Curotto and M. Evason and A.
                 Failla and P. Kusterer and A. Ogawa and J. Paraszczak
                 and S. Raghavan",
  title =        "A unique approach to corporate disaster philanthropy
                 focused on delivering technology and expertise",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "2:1--2:14",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2960244",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Baxter:2020:QMD,
  author =       "A. E. Baxter and H. E. {Wilborn Lagerman} and P.
                 Keskinocak",
  title =        "Quantitative modeling in disaster management: a
                 literature review",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "3:1--3:13",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2960356",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Krook:2020:CCD,
  author =       "D. Krook and S. Malaika",
  title =        "Call for Code: Developers tackle natural disasters
                 with software",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "4:1--4:8",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2960241",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Albrecht:2020:NGG,
  author =       "C. M. Albrecht and B. Elmegreen and O. Gunawan and H.
                 F. Hamann and L. J. Klein and S. Lu and F. Mariano and
                 C. Siebenschuh and J. Schmude",
  title =        "Next-generation geospatial-temporal information
                 technologies for disaster management",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "5:1--5:12",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.2970903",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Treinish:2020:PIW,
  author =       "L. Treinish and A. Praino and M. Tewari and B.
                 Hertell",
  title =        "Predicting impacts of weather-driven urban disasters
                 in the current and future climate",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "6:1--6:13",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947016",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nair:2020:MLA,
  author =       "R. Nair and B. S. Madsen and H. Lassen and S. Baduk
                 and S. Nagarajan and L. H. Mogensen and R. Novack and
                 R. Curzon and J. Paraszczak and S. Urbak",
  title =        "A machine learning approach to scenario analysis and
                 forecasting of mixed migration",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "7:1--7:7",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2948824",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Enenkel:2020:EDS,
  author =       "M. Enenkel and R. M. Shrestha and E. Stokes and M.
                 Rom{\'a}n and Z. Wang and M. T. M. Espinosa and I.
                 Hajzmanova and J. Ginnetti and P. Vinck",
  title =        "Emergencies do not stop at night: Advanced analysis of
                 displacement based on satellite-derived nighttime light
                 observations",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "8:1--8:12",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2954404",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kreutzer:2020:IHN,
  author =       "T. Kreutzer and P. Vinck and P. N. Pham and A. An and
                 L. Appel and E. DeLuca and G. Tang and M. Alzghool and
                 K. Hachhethu and B. Morris and S. L. Walton-Ellery and
                 J. Crowley and J. Orbinski",
  title =        "Improving humanitarian needs assessments through
                 natural language processing",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "9:1--9:14",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947014",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Murakami:2020:URI,
  author =       "A. Murakami and T. Nasukawa and K. Watanabe and M.
                 Hatayama",
  title =        "Understanding requirements and issues in disaster area
                 using geotemporal visualization of Twitter analysis",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "10:1--10:8",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2962491",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Allen:2020:CCU,
  author =       "T. Allen and E. Wells and K. Klima",
  title =        "Culture and cognition: Understanding public
                 perceptions of risk and (in)action",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "11:1--11:17",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2952330",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Nagurney:2020:QSC,
  author =       "A. Nagurney and Q. Qiang",
  title =        "Quantifying supply chain network synergy for
                 humanitarian organizations",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "12:1--12:16",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2940430",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Shiri:2020:OOF,
  author =       "D. Shiri and F. S. Salman",
  title =        "Online optimization of first-responder routes in
                 disaster response logistics",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "13:1--13:9",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947002",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dalal:2020:DAW,
  author =       "S. Dalal and D. Bassu",
  title =        "Deep analytics for workplace risk and disaster
                 management",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "14:1--14:9",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945693",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pandey:2020:ECT,
  author =       "P. Pandey and R. Litoriya",
  title =        "Elderly care through unusual behavior detection: a
                 disaster management approach using IoT and
                 intelligence",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "15:1--15:11",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2947018",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Klima:2020:CWR,
  author =       "K. Klima and L. {El Gammal} and W. Kong and D.
                 Prosdocimi",
  title =        "Creating a water risk index to improve community
                 resilience",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "1/2",
  pages =        "16:1--16:11",
  month =        jan # "\slash " # mar,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2945301",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Thu Feb 27 10:00:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:FCb,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "C1--C1",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:TCb,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "1--2",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:PSS,
  author =       "Anonymous",
  title =        "Preface: {Summit} and {Sierra} Supercomputers",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "1--4",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Hanson:2020:CSS,
  author =       "W. A. Hanson",
  title =        "The {CORAL} supercomputer systems",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "1:1--1:10",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2960220",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Roberts:2020:RIP,
  author =       "S. Roberts and C. Mann and C. Marroquin",
  title =        "Redefining {IBM} power system design for {CORAL}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "2:1--2:10",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Stunkel:2020:HSN,
  author =       "C. B. Stunkel and R. L. Graham and G. Shainer and M.
                 Kagan and S. S. Sharkawi and B. Rosenburg and G. A.
                 Chochia",
  title =        "The high-speed networks of the {Summit} and {Sierra}
                 supercomputers",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "3:1--3:10",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Islam:2020:BHP,
  author =       "R. Islam and G. Shah",
  title =        "Building a high-performance resilient scalable storage
                 cluster for {CORAL} using {IBM ESS}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "4:1--4:9",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tian:2020:SSS,
  author =       "S. Tian and T. Takken and V. Mahaney and C. Marroquin
                 and M. Schultz and M. Hoffmeyer and Y. Yao and K.
                 O'Connell and A. Yuksel and P. Coteus",
  title =        "{Summit} and {Sierra} supercomputer cooling
                 solutions",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "5:1--5:12",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Liebsch:2020:CIA,
  author =       "T. Liebsch",
  title =        "Concurrent installation and acceptance of {Summit} and
                 {Sierra} supercomputers",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "6:1--6:8",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Besaw:2020:CSM,
  author =       "N. Besaw and L. Scheidenbach and J. Dunham and S. Kaur
                 and A. Ohmacht and F. Pizzano and Y. Park",
  title =        "Cluster system management",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "7:1--7:9",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Solt:2020:SFT,
  author =       "D. Solt and J. Hursey and A. Lauria and D. Guo and X.
                 Guo",
  title =        "Scalable, fault-tolerant job step management for
                 high-performance systems",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "8:1--8:9",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sharkawi:2020:CPO,
  author =       "S. S. Sharkawi and G. A. Chochia",
  title =        "Communication protocol optimization for enhanced {GPU}
                 performance",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "9:1--9:9",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Dahm:2020:SCE,
  author =       "J. P. Dahm and D. F. Richards and A. Black and A. D.
                 Bertsch and L. Grinberg and I. Karlin and S.
                 Kokkila-Schumacher and E. A. Le{\'o}n and J. R. Neely
                 and R. Pankajakshan and O. Pearce",
  title =        "{Sierra Center of Excellence}: Lessons learned",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "2:1--2:14",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Luo:2020:PEA,
  author =       "L. Luo and T. P. Straatsma and L. E. A. Suarez and R.
                 Broer and D. Bykov and E. F. D'Azevedo and S. S. Faraji
                 and K. C. Gottiparthi and C. {De Graaf} and J. A.
                 Harris and R. W. A. Havenith and H. J. A. Jensen and W.
                 Joubert and R. K. Kathir and J. Larkin and Y. W. Li and
                 D. I. Lyakh and O. E. B. Messer and M. R. Norman and J.
                 C. Oefelein and R. Sankaran and A. F. Tillack and A. L.
                 Barnes and L. Visscher and J. C. Wells and M. Wibowo",
  title =        "Pre-exascale accelerated application development: The
                 {ORNL Summit} experience",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "11:1--11:21",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.2965881",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bercea:2020:OSS,
  author =       "G. T. Bercea and A. Bataev and A. E. Eichenberger and
                 C. Bertolli and J. K. O'Brien",
  title =        "An open-source solution to performance portability for
                 {Summit} and {Sierra} supercomputers",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "12:1--12:23",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2955944",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/gnu.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Eichenberger:2020:HCG,
  author =       "A. E. Eichenberger and G.-T. Bercea and A. Bataev and
                 L. Grinberg and J. K. O'Brien",
  title =        "Hybrid {CPU\slash GPU} tasks optimized for concurrency
                 in {OpenMP}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "13:1--13:14",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2960245",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/pvm.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Tiotto:2020:OCO,
  author =       "E. Tiotto and B. Mahjour and W. Tsang and X. Xue and
                 T. Islam and W. Chen",
  title =        "{OpenMP 4.5} compiler optimization for {GPU}
                 offloading",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "14:1--14:11",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2019.2962428",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/pvm.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Beckingsale:2020:UAF,
  author =       "D. A. Beckingsale and M. J. McFadden and J. P. S. Dahm
                 and R. Pankajakshan and R. D. Hornung",
  title =        "{Umpire}: Application-focused management and
                 coordination of complex hierarchical memory",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "00:1--00:10",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Maerean:2020:TAE,
  author =       "S. Maerean and E. K. Lee and H.-F. Wen and I. Chung",
  title =        "Transformation of application enablement tools on
                 {CORAL} systems",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "16:1--16:12",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Pankajakshan:2020:PSM,
  author =       "R. Pankajakshan and P.-H. Lin and B. Sj{\"o}green",
  title =        "Porting a {$3$D} seismic modeling code ({SW4}) to
                 {CORAL} machines",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "17:1--17:11",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Coletti:2020:TDL,
  author =       "M. Coletti and A. Fafard and D. Page",
  title =        "Troubleshooting deep-learner training data problems
                 using an evolutionary algorithm on {Summit}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "3/4",
  pages =        "1--12",
  month =        may # "\slash " # jul,
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Wed Jun 3 18:35:26 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/super.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:FC,
  author =       "Anonymous",
  title =        "Front Cover",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "C1--C1",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:TC,
  author =       "Anonymous",
  title =        "Table of Contents",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "1--2",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Mauri:2020:MGM,
  author =       "R. A. Mauri",
  title =        "Message From the {General Manager, IBM Z}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "1--2",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Anonymous:2020:PIZ,
  author =       "Anonymous",
  title =        "Preface: {IBM z15} Design and Technology",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "1--4",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Bieswanger:2020:IZS,
  author =       "A. Bieswanger and A. Maier and C. Mayer and H. Shah
                 and J. Candee",
  title =        "{IBM Z} in a secured hybrid cloud",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "1:1--1:10",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Borntrager:2020:SYC,
  author =       "C. Borntr{\"a}ger and J. D. Bradbury and R.
                 B{\"u}ndgen and F. Busaba and L. C. Heller and V.
                 Mihajlovski",
  title =        "Secure your cloud workloads with {IBM Secure Execution
                 for Linux} on {IBM z15} and {LinuxONE III}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "2:1--2:11",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib;
                 https://www.math.utah.edu/pub/tex/bib/linux.bib;
                 https://www.math.utah.edu/pub/tex/bib/unix.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Busby:2020:ICC,
  author =       "J. A. Busby and E. N. Cohen and E. A. Dames and J.
                 Doherty and S. Dragone and D. Evans and M. J. Fisher
                 and N. Hadzic and C. Hagleitner and A. J. Higby and M.
                 D. Hocker and L. S. Jagich and M. J. Jordan and R.
                 Kisley and K. D. Lamb and M. D. Marik and J. Mayfield
                 and T. E. Morris and T. D. Needham and W.
                 Santiago-Fernandez and V. Urban and T. Visegrady and K.
                 Werner",
  title =        "The {IBM 4769} Cryptographic Coprocessor",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "3:1--3:11",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008145",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/cryptography2020.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Driever:2020:SES,
  author =       "P. G. Driever and R. Hathorn and C. Colonna",
  title =        "Securing the enterprise {SAN} with {IBM Fibre Channel
                 Endpoint Security}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "4:1--4:8",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webel:2020:ZSS,
  author =       "T. Webel and O. Morlok and D. Kiss",
  title =        "{z15} selfboot and secure boot",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "5:1--5:9",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Surman:2020:SRB,
  author =       "D. H. Surman and S. Lederer and D. B. Petersen and M.
                 Gubitz and P. J. Relson",
  title =        "System Recovery Boost on {IBM z15}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "6:1--6:10",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Saporito:2020:DIZ,
  author =       "A. Saporito and M. Recktenwald and C. Jacobi and G.
                 Koch and D. P. D. Berger and R. J. Sonnelitter and C.
                 R. Walters and J.-S. Lee and C. Lichtenau and U. Mayer
                 and E. Herkel and S. Payer and S. M. Mueller and V. K.
                 Papazova and E. M. Ambroladze and T. C. Bronson",
  title =        "Design of the {IBM z15} microprocessor",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "7:1--7:18",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008119",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Berry:2020:IZP,
  author =       "C. J. Berry and D. Wolpert and B. Bell and A.
                 Jatkowski and J. Surprise and G. Strevig and J. Isakson
                 and O. Geva and B. Deskin and M. Cichanowski and G.
                 Biran and D. Hamid and C. Cavitt and G. Fredeman and D.
                 Chidambarrao and B. Bruen and M. Wood and S. Carey and
                 D. Turner and L. Sigal",
  title =        "{IBM z15}: Physical design improvements to
                 significantly increase content in the same technology",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "8:1--8:12",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008099",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Klein:2020:DVD,
  author =       "M. Klein and A. Misra and B. Abali and P. Sethia and
                 S. Weishaupt and B. Giamei and M. Farrell and T. J.
                 Slegel",
  title =        "Design and verification of {DEFLATE} acceleration as
                 an architected instruction in {z15}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "9:1--9:10",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008099",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/datacompression.bib;
                 https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Sofia:2020:IZP,
  author =       "A. T. Sofia and M. Klein and B. D. Stilwell and S.
                 Weishaupt and Q. Y. Chen and R. W. S. John",
  title =        "Integration of {z15} processor-based {DEFLATE}
                 acceleration into {IBM z/OS}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "10:1--10:8",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008101",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Somasundaram:2020:PPP,
  author =       "M. Somasundaram and J. P. Kubala and S. E. Lederer and
                 J. Chan",
  title =        "Partition placement by {PR\slash SM}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "11:1--11:7",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Guendert:2020:STS,
  author =       "S. R. Guendert and J. S. Houston and P. A. Wojciak and
                 S. Cherniak and D. L. Massey",
  title =        "Sysplex time synchronization using {IEEE 1588
                 Precision Time Protocol (PTP)}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "12:1--12:9",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008108",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Valentine:2020:DII,
  author =       "B. D. Valentine and M. A. Clark and B. E. Myers and P.
                 Callaghan and J. A. Wierbowski and P. J. Clas",
  title =        "Design innovations for {IBM Z} hardware management
                 appliance",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "13:1--13:9",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{McCain:2020:IZD,
  author =       "E. C. McCain and P. Bastien and B. F. Belmar and B.
                 Bhattacharya and K. K. Cheruiyot and M. Coq and R.
                 Dartey and K. Deekaram and K. Ghadai and L. D. Lalima
                 and J. Nettey and A. W. Owolabi and K. Phillips and T.
                 M. Shiling and D. T. Schroeder and C. Slegel and B.
                 Steen and D. A. Thorne and E. Venuto and J. D.
                 Willoughby and D. Yaniv and N. Ziemis",
  title =        "{IBM Z} development transformation",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "14:1--14:13",
  year =         "2020",
  CODEN =        "IBMJAE",
  DOI =          "https://doi.org/10.1147/JRD.2020.3008122",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Webel:2020:PPM,
  author =       "T. Webel and P. M. Lobo and T. Strach and P. B.
                 Parashurama and S. Purushotham and R. Bertran and A.
                 Buyuktosunoglu",
  title =        "Proactive power management in {IBM z15}",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "15:1--15:12",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}

@Article{Kostenko:2020:IZI,
  author =       "W. P. Kostenko and J. G. Torok and D. W. Demetriou",
  title =        "{IBM z15}: Improved data center density and energy
                 efficiency, new system packaging, and modeling",
  journal =      j-IBM-JRD,
  volume =       "64",
  number =       "5/6",
  pages =        "16:1--16:10",
  year =         "2020",
  CODEN =        "IBMJAE",
  ISSN =         "0018-8646 (print), 2151-8556 (electronic)",
  ISSN-L =       "0018-8646",
  bibdate =      "Fri Aug 28 09:26:17 2020",
  bibsource =    "https://www.math.utah.edu/pub/tex/bib/ibmjrd.bib",
  acknowledgement = ack-nhfb,
  fjournal =     "IBM Journal of Research and Development",
  journal-URL =  "http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5288520",
}